FOREWORD

Welcome to the new NIST!

Since 1988 and passage of the Omnibus

Trade and Competitiveness Act, the National

Institute of Standards and Technology

(NIST) has been expanding its outreach

efforts to industry. These have included

establishment of three relatively new extra- mural programs—the Advanced Technology' Program, providing direct grants to

industrv' for high-risk technolog}' develop- ment; the Manufacturing Extension Partnership, a grassroots technolog)' extension

service; and the Malcolm Baldrige National

Qualit}' Award. The Institute also has substantially increased the number of cooperative programs between industry' scientists and engineers and NIST laboratory

researchers.

Now we're gearing up for even bigger

changes. The Clinton Administration has made improved development, commercialization, and adoption of new technology' by

U.S. industry- a central element of its plan

for U.S. economic growth. NIST has a vital

role to play in helping turn these plans into

reality.

Over the next few years, NIST plans to use

requested funding increases to transform

itself from primarily a measurement laboratory program with three relatively small extramural programs to a full-service tech- nology development, funding, extension, and quality improvement partner for U.S.

industry. To help get that job done, we have begun a major construction and renovation program to bring the Institute's laboratory

facilities up to the needs of the 21st century and beyond.

You'll see the beginnings of this transfor- mation within this guide. We've included expanded descriptions of NIST extramural

programs, more comprehensive coverage of NIST laboratory projects and facilities, and more detailed guidance on the many differ- ent ways—both formal and informal—that

industrial and other organizations can work

cooperatively with NIST. Also for the first

time, the guide includes email addresses for most NIST research contacts listed and infor- mation on electronic bulletin boards open

to use by the public.

We hope you'll use this guide to find the NIST programs, research projects, products, or services that best match your organization's needs. Then make the most of your

federal tax dollars. Work with us to make

all aspects of U.S. technology—from devel- opment to commercialization to adoption

by manufacturers—the envy of the world.

Arati Prabhakar, Director email: director@micf.nist.gov
NIST AT A GLANCE

The National Institute of Standards and

Technology was established by Congress "to

assist industry in the development of tech- nology ... needed to improve product quality, to modernize manufacturing processes,

to ensure product reliability ... and to facilitate rapid commercialization ... of products based on new scientific discoveries."

hn agency of the U.S. Department of Commerce's Technology Administration, NIST's primary mission is to promote U.S. eco- nomic growth by working with industry to develop and apply technology, measurements, and standards. It carries out this mission through a portfolio of four major

programs:

• a rigorously competitive Advanced Tech- nology Program providing cost-shared

grants to industry for development of highrisk technologies with significant commercial potential;

• a grassroots Manufacturing Extension

Partnership helping small and mediumsized companies adopt new technologies;

• a strong laboratory effort planned and

implemented in cooperation with industry and focused on measurements, standards, evaluated data, and test methods; and

• a highly visible quality outreach pro- gram associated with the Malcolm Baldrige National Quality Award.

BUDGET

$609 million (FY 94 estimated operating resources from

all sources)

STAFF

About 3,200 scientists, engineers, technicians, and support personnel, plus some

1,200 visiting researchers each year

SITES

Gaithersburg, Md. (headquarters

234-hectare campus) and

Boulder, Colo. (84-hectare campus)

MAIN RESEARCH AREAS IN NIST LABORATORIES

Electronics and electrical engineering

Manufacturing engineering

Chemical science and technology

Physics

Materials science and engineering

Building and fire research Computer systems Computing and applied mathematics
CONTENTS

4 How To Use This Guide

5 What NISTHasTo Offer

10 Advanced Technology Program

13 IVIanufacturIng Extension Partnership

15 IVIalcolm Baldrige National Quality Award

16 Laboratory Programs

16 Technology Services

22 Electronics and Electrical Engineering Laboratory

38 Manufacturing Engineering Laboratory

46 Chemical Science and Technology Laboratory

63 Physics Laboratory

745 76 Materials Science and Engineering Laboratory

93 Building and Fire Research Laboratory

102 Computer Systems Laboratory

109 Computing and Applied Mathematics Laboratory

113 Facilities Index

113 Subject Index
HOW TO USE

THIS GUIDE

Finding who or wliat you need within a federal agency can be a daunting task. This

guide is designed to make finding out about programs and contacts at the National Institute of Standards and Technology a little

easier.

NIST researchers actively seek out industrial and other collaborators to work on welldefined, cooperative research projects of mutual interest. In addition, NIST

researchers collaborate informally with

industrial and academic researchers to solve shorter-term technical problems. For an

ovei'view of the many different ways NIST may be able to help your organization,

see "What NIST Has to Offer" on page 5.

The pages that follow describe more than 250 NIST research projects, grants and

industiy outreach programs, sei^ices, and

facilities, followed by contact names, phone

numbers, and mail and electronic mail

(Internet) addresses for further information. Unless otherwise noted, all addresses

listed are at NIST, Gaithersburg, Md.

20899-0001.

This guide is divided into chapters covering each of NIST's major operating units.

In addition, each chapter on laboratory

research programs includes subheadings

for NIST organizational divisions.

A detailed subject index is included on

pages 113 to ll6. Due to the interdiscipli- naiy nature of NIST's work, many topic areas appear in more than one chapter. For example, research involving polymers is described in different chapters: polymer

processing and structure investigations within the Materials Science and Engineering Laboratory and polymer combustion

studies within the Building and Fire Research Laboratory.

This guide attempts to include all major NIST program areas. However, no single

report can be completely comprehensive.

Institute programs change constantly as new research results and technologies

become available. If you don't find a topic area that specifically matches your needs, contact the division office for the research area closest to your field of interest. Phone

numbers, fax numbers, and electronic mail

addresses for division contacts are provided

within each chapter.

If you review this guide and you're still not

sure which office to call, the NIST Publications and Program Inquiries Unit can probably help you. Contact: Publications and

Program Inquiries Unit, (301) 975-3058.
WHAT NIST

HAS TO OFFER

Advanced

Technology Program

This program provides multiyear funding

for high-risk, high-payoff, civihan technolog)' development by individual companies

or industry-led joint ventures. See descrip- tion on page 10.

Manufacturing

Extension Partnership

This program provides funding for regionally based extension centers that help small and medium-sized businesses adopt modern

technologies. MEP also provides matching

grants for state-based technology extension

efforts and develops linkages between federal, state, local, and other technology

extension efforts. See description on

page 13.

Collaborative Research

NIST actively seeks industrial, academic, and non-profit research partners to work

collaboratively on projects of mutual

benefit. A wide variety of mechanisms are

available for earning out these research

collaborations. Special efforts are made to

tailor collaborations to specific needs.

Most research collaborations start with

one-to-one interactions between industry or other researchers and NIST scientists and

engineers. To locate NIST researchers in specific fields of interest, see the project listings on pages 22 to 112. For further information about the process for implementing specific

types of research agreements, contact the Technology Development and Small Business Program, (301j 975-3084.

The most common types of arrangements

include:

Cooperative Research and Development

Agreements (CRADAs)

Typically cover joint research efforts in which both NIST and the cooperating company provide staff, equipment, facilities, and/or funds, in any number of possible

combinations, for a project of mutual

interest. NIST is currently working with more than 200 research partners on nearly 250 CRADAs in 16O different areas of research. Ninety-five percent of NIST's CRADA partners are U.S. businesses, with about equal numbers from large and small companies.

When companies conduct joint research with the Institute under a CRADA, NIST can

protect confidential or proprietary information exchanged during the project, keep

research results confidential, and provide

exclusive rights for intellectual property developed during the course of the project. Each CRADA is negotiated separately be- tween NIST and prospective partners. Most CRADAs take 6 to 8 weeks to implement.

Copies of a model NIST CRADA agreement

are available from the NIST Technology

Development and Small Business Program,

(301) 975-3084.

Guest Researcher Agreements

Typically used when an industrial or other

researcher wishes to join an ongoing NIST

research effort. The researcher gains access

to NIST research staff and facilities and, in

return, results from the collaboration are made publicly available. Such agreements cannot protect proprietary information and

do not allow cooperating companies to receive exclusive intellectual property rights. Once a NIST research group agrees to host a

guest researcher, implementation of such

agreements takes only about 1 week. Each

year NIST hosts about 1,200 guest scientists and engineers at its Gaithersburg, Md.,

and Boulder, Colo., laboratories. Contact: domestic guest researchers, (301) 975-3084;

international guest researchers, (301) 975-4119.

Research and Development Contracts Used when external organizations contract with NIST researchers to receive specific technical services or results uniquely avail- able at the Institute. The cooperating

organization funds the NIST effort on a cost- reimbursable basis. Individual contracts may provide protection of proprietary infor- mation under certain circumstances.

Research results are made publicly available, and any intellectual property rights

revert to NIST.

Preparation of contracts for such agree- ments typically takes about 4 weeks.

Informal Collaborations Informal one-to-one collaborations between

Institute and other researchers. Such col- laborations often involve exchange of research results and/or samples between NIST and other researchers, rather than

transfers of personnel or research funds.

Research Consortia

On research topics of broad interest to a number of different research partners, NIST may sponsor research consortia. Research

consortia are usually structured through NIST CRADAs and involve groups of companies and other organizations that exchange

data, ideas, researchers, and/or materials among themselves and with NIST to meet

agreed-upon research goals. Most consortia

require payment of membership fees in exchange for advance knowledge of research results produced by the consortia

effort. Currently active NIST-centered consortia open to participation by U.S.-based companies include the following:
WHAT NIST HAS TO OFFER

Fluid Flow Measurements

Supports research in fluid flow measure- ments to help industry understand, evaluate, and assess flowmeter performance

under non-ideal conditions. Contact: George Mattingly, (301) 975-5939-

Production of Powdered Metals

Applies advanced intelligent processing

techniques to improve the quality and

productivity of advanced metal powder processing used in making jet engines, highperformance magnets, and other hightechnology applications. Contact:

Neville Pugh, (301) 975-5960.

North American Integrated Services Digital Network Users' Forum

Promotes the implementation and use of ISDN standards and the development of interoperable systems for the simultaneous

transmission of voice, data, and images

over high-speed digital networks. Contact: Daniel Stokesberry, (301) 975-3605.

Microwave Monolithic Integrated Circuits Develops metrology for design and manufacture of microwave monolithic-integrated circuits, especially measurement methods and

standards to reduce testing costs. Contact: Gerome Reeve, (303) 497-3557.

Consortium on Automated Analytical

Laboratory Systems (CAALS)

Fosters advancement of automated analytical systems to improve laboratory efficiency and data quality and to promote transferability of analytical methods so U.S. companies can compete internationally. Contact: Gary Kramer, (301) 975-4132.

Investigation of S2F10 Production

Investigates the production of SzFioin compressed SF6 insulated electrical power equipment and provides utilities and other

interested parties with information on safe and prudent operation of such equipment.

Contact: Joseph Greenberg, (301) 975-2439-

Ceramic Machining Consortium

Develops cost-effective production processes

for grinding components made from ad- vanced, structural ceramics, such as silicon

nitride and silicon carbide. Contact: Said Jahanmir, (301) 975-3671.

SUCCESS STORIES

For those who need convincing that federal government programs can produce

substantial private-sector benefits, consider the following examples from each

of NIST's four major program areas.

Advanced Technology Program

• According to a recent survey of initial ATP grant recipients, funding provided by

the program enabled a number of companies to pursue research they otherwise would not have been able to do. Typical comments included, "We would not have

been able to do this kind of work at all [without the ATP]." ... "and [the ATP]

enabled us to keep a highly specialized

and trained team together over a long

period of time to pursue a technology."

• Sixty-nine percent of respondents to the survey reported a significant shortening of the R&D cycle over the first year of their funding.

• All of the single-company award recipients and most of the joint venture partici- pants cited the credibilit)' the company

and the technology gained by receiving an ATP award. Smaller companies emphasized that this assisted them in attracting external funding; larger companies found

that they received increased support from

internal management for the project.

• Over half of the ATP awards in the

first three competitions are led by small

businesses. In addition, many more

small businesses are subcontractors to the participating organizations. These companies have indicated that ATP funding is

critical to their pursuit of the proposed

ologies.

anufacturlng Extension Partnership

• Results of a pilot evaluation system

with a small number of companies in- volved in modernization projects with MTC assistance showed that within 2 years

these firms, on average, increased employment by 15 percent, productivity by 7 per- cent per employee, and sales by 34 percent.

• From January 1989 through June 1991,

client companies estimated that the MTCs

helped them save a total of $139 million—or eight times more than the total

federal investment of $18 million during

that time.

• Many individual companies have used MTC advice and services to successfully

adopt new technologies and increase

profits:

Newburgh Molded Products used new

processing technology to increase its production volume by two-thirds and

reduce waste.

Kintz Plastics bought new automation

equipment to cut its production time for making steel and aluminum molds

from 8 weeks to 8 days.

Brimfield Precision saved over $200,000 on the purchase of a new computeraided design and manufacturing system

after trying out several systems at an MTC and choosing a less expensive sys- tem than the one they previously

thought was necessary.

A South Carolina forklift manufacturer

shaved 2 years off the planning and

evaluation stage of its transition to a

robotic painting and welding system.

A New York-based vitamin manufacturer sped up production and cut its time for filling back orders by better than 50 percent.

NIST Laboratory Research

• U.S. semiconductor manufacturers

attributed 4 percent of their productivity

growth over a 5-year period and annual

savings of up to $500 million to NIST

research.

• A NIST technique for measuring the performance of microwave antennas revolutionized quality control for 11 U.S.
WHAT NIST HAS TO OFFER 7

I manufacturers. One company estimated

that the new technology' saved their company S35 miUion in testing costs.

• NIST researchers working with an

Institute-sponsored consortia developed a computer model that helped one member

company. Crucible Compaction Metals, increase the percentage of usable metal powI der made at its production facilit}' by over 40 percent.

• More than 50 companies have sent

researchers to work with Institute rej searchers at NIST's Automated Manufacturing Research Facilit\" and more than

20 products and subsystems developed at the AMRF have been commercialized.

• The CEM Corp. credits much of its success in developing new markets for

laboratory' microwave units to an 8-year

successful collaboration with NIST

researchers.

• A NIST-developed method for measuring light reflection produces savings of about $500 million per year for large seg- ments of the U.S. medical, agricultural, food processing, paper, plastics, and build- ing materials industries.

• Laboratory inaccuracies in measure- ments of cholesterol in blood samples

have decreased by half since introduction

of NIST Standard Reference Materials for those measurements.

• Axis Instruments is marketing a preci- sion instrument based on a NIST design

that makes absolute measurements of the

Earth's gravitational field 5 to 10 times more accurately than previously possible.

• Intel's Supercomputer Systems Division has incorporated a NIST-developed per- formance measurement chip into its Paragon XP/S supercomputers.

• NIST-developed smoke detector perform- ance requirements, installation guidelines, and subsequent studies have helped U.S. manufacturers acquire a 50-percent share

of the world market.

• A NIST project with SEMATECH estab- lished calibration procedures that markedly improved the accuracy of commercial

near-ultraviolet radiometers used in semi- conductor photolithography.

• Optical ETC is making microheaters for infrared flat-panel displays using a NISTdeveloped technology.

• Teradyne Inc. worked with NIST to pro- duce a software package that reduces the number of testing points required for a

13-bit analog-to-digital converter from more than 8,000 to 64.

Malcolm Baldrige National Quality Award

• A 1991 General Accounting Office report

calls the Malcolm Baldrige National Quality' Award criteria "the most widely used

accepted formal definition of what constitutes a total quality management company." "In nearly all cases," the report

states, "companies that used total quality

management practices achieved better employee relations, higher productivity,

greater customer satisfaction, increased market share, and improved profitability."

• In a letter to the U.S. Secretary of Commerce, Solectron Corp., a 1991 award winner, noted, "Since we applied for the Malcolm Baldrige award in 1989, Solectron's sales have increased 3l6 percent and profit has increased 338 percent in

3 years.... We attribute our financial per- formance a great deal to the improvement we made through the rigorous examination and feedback from the Baldrige application process."

• Another Baldrige winner, Globe Metallurgical Inc. estimates that its investments

in quality have produced a 40-1 return.

• Motorola Inc. considers the criteria for

the Baldrige Award so important that it has given its suppliers until 1994 to follow

the award criteria or risk losing Motorola

as a customer for their products.

Processing of Polymer Blends

Uses NIST measurement tools to develop the data and processing models industry needs

to produce new and more economical poly- mer blends and alloys. Contact: Thomas

Yolken, (301) 975-5727.

Advanced Biosensors Works to hasten development of biosensors

that could dramatically change the way

laboratories analyze medical, environ- mental, and industrial samples. Contact: Howard Weetall, (301) 975-2628.

Casting of Aerospace Alloys

Supports efforts to improve understanding

and, ultimately, control of the net-shape

casting process so that the alloys in finished

parts attain the desired structural and per- formance properties. Contact: Robert

Schaefer, (301) 975-5727.

Polymers Processing Measurements

Improves processing techniques used in

the manufacture of advanced polymer materials, including on-line measurement tech- nology to monitor polymer processing. Contact: Thomas Yolken, (301) 975-5727.

Intelligent Processing of Ceramic

Powders and Slips Focuses on developing measurement methods for on-line process control and process modeling for advanced ceramic powders and slips. Contact: Subhas Malghan,

(301) 975-6101.

Technical Assistance

NIST provides two different forms of assis- tance to U.S. companies and others seeking

advice in specific technical areas.

Direct Assistance from NIST Researchers

Informal technical advice provided without charge by NIST researchers. Often NIST

experts can help a company solve a technical problem through one or several phone

conversations or a brief visit to the Institute's Gaithersburg, Md., or Boulder, Colo.,

laboratories. (Institute researchers are not permitted to consult on their own behalf or

to receive personal payments for technical

advice in areas within NIST's mission.)
8 WHAT NIST HAS TO OFFER

See project descriptions on pages 22 to 112

to locate a NIST expert in a specific research field or call the Publications and

Program Inquiries Unit for assistance, (301) 975-3058.

Assistance from a NIST Manufacturing

Teclinoiogy or Outreacli Center Formal or informal technical services and

advice provided by NIST's regionally based Manufacturing Technology Centers (MTCs)

and affiliated organizations. Operated

through NIST's Manufacturing Extension

Partnership, NIST MTCs and outreach centers give "hands on" technical assistance to small and medium-sized manufacturers and provide referral services to locate additional technical resources. Informal assis- tance is free; more extensive service may

require payment of modest fees. See page 13.

Technology

Services and Products

NIST provides many different technology

services and products to help U.S. industry

improve the quality, reduce the cost, and

increase the competitiveness of its products.

Summaries of the NIST programs providing

these services and products appear on pages

1 6 to 21. Examples include Standard Refer- ence Materials, Standard Reference Data,

calibration and laboratory accreditation

services, and evaluations of energy-related

inventions.

Use of NIST Facilities

The Institute operates more than 40 differ- ent research facilities that are accessible to outside researchers for collaborative or inde- pendent research. Some are one-of-a-kind

facilities not available elsewhere in the United States.

Access to NIST facilities generally occurs through one of four mechanisms: under the provisions of a NIST CRADA or consortium

agreement; through a guest researcher

agreement; through contract R&D in which

Institute staff members conduct specific experiments or tests at NIST and are reim- bursed for their time and supplies; and, for a limited number of facilities, through

scheduled appointments for qualified researchers wishing to conduct proprietary

research.

Scheduling and priorities for NIST facilities use are determined by the relevant director

for each NIST disciplinary laboratory, in some cases assisted by designated user group committees.

An index of NIST facilities appears on

page 113. For detailed information on capabilities and availability of individual facilities, call the contact person listed for that

facility. For general information on typical

facility use agreements, contact the Technol- ogy Development and Small Business Pro- gram, (301) 975-3084,

Technology Licenses

NIST seeks patents for its product and process inventions with commercial potential. Individuals or companies may obtain a

license to use, make, or sell NIST patented

inventions, on either an exclusive or nonexclusive basis. Normally licenses are granted

only in cases where the licensee agrees that resulting products will be manufactured

substantially in the United States.

The goal of NIST's licensing process is

to encourage commercial use of NISTdeveloped technologies.

For a current listing of the more than

120 NIST inventions available for

licensing, contact the NIST Technology

Development and Small Business Program,

(301) 975-3084.

Quality Improvement

Assistance

The NIST Office of Quality Programs manages the Malcolm Baldrige National Quality

Award and supplies interested businesses with guidelines and criteria important for establishing successful quality management

programs. See description on page 15.

Research Grants

Grants supporting research at industry, aca- demic, and other institutions are available on a competitive basis through several dif- ferent Institute offices. For general information on NIST grants programs, contact

(301) 975-6328.

Small Business Innovation Research

Program

Funds proposals by small businesses for research and development efforts that fall within areas recommended yearly by the

U.S. Department of Commerce. See description on page 21.

Precision Measurement Grants

Supports researchers in U.S. colleges and

universities for experimental and theoretical studies of fundamental physical phe- nomena. Contact: (301) 975-5607.

Fire Research Grants

Sponsors research by academic institutions, non-federal government agencies, and inde- pendent and industrial laboratories that supports NIST's fire research laboratory programs. Contact: (301) 975-6854.

Standard Reference Data Grants

Supports research at academic, industrial, and other non-federal institutions to critically evaluate data in chemistry, physics, and materials properties. Contact: (301) 975-2200.

Materials Science and Engineering Grants

Supports work in polymers, ceramics, metallurgy, and neutron scattering and spectros- copy research at academic, industrial, and

other non-federal institutions. Contact: (301) 975-5658.
WHAT NIST HAS TO OFFER 9

Publications

NIST issues more than 350 pubhcations each year, such as reports on research results and standards, catalogs of products

and services, and technical handbooks. NIST staff also author about 1,300 technical journal papers. The Publications and Pro- gram Inquiries Unit provides assistance to

the public in locating current and past

Institute publications, (301) 975-3058.

The Institute also publishes serial publications, including:

Journal of Research of ttie National

Institute of Standards and Technology

Issued bimonthly. Subscription price: domestic—S27 per year, foreign

$33-75 per year. Reports NIST research and

I development results in physics, chemistr}',

engineering, mathematics, and computer

science, with major emphasis on measure- ment methodology and basic technolog}'

underlying standardization. Contact: (202) 783-3238.

I

' Technology at a Glance

Issued quarterly. Free subscription. A four- page, lay language newsletter providing

brief updates on NIST research, grants, and

other program activities. Includes a NIST

contact name for each topic covered.

Contact: Gail Porter, (301) 975-3392.

Electronic Information

Retrieval Systems

NIST operates a number of different electronic information retrieval systems and

bulletin boards designed to encourage dis- semination of information on a variety of

topics. For assistance locating information on NIST programs not provided by these

bulletin boards, contact the NIST Publications and Program Inquiries Unit, (301) 975-3058, email: inquiries@enh.nist.gov.

NIST Gopher Information Service

Part of the Gopher system on the Internet. Allows users to search through databases using menus to locate materials of interest. The range of topics included in the Gopher

sen'ice continually expands. As of late 1993, menu items on the following topics were

included: text from this brochure. Guide to NIST; Guide to Available Mathematical Soft- ware (GAAIS); computer security; open sys- tems engineering; Standard Reference Data

Program; and NIST phone book and email

director}'.

To access the NIST Gopher server via

Internet:

• from remote log in, t}Tpe "telnet

gopher.nist.gov.'" At the log in prompt, t^pe "gopher."

• from a gopher client, use the gopher ser\'-

er as "gopherserver.nist.gov" with port 70.

STEP On-Line Information Service (SOLIS)

Provides access to draft standards, support- ing documents, and software that contribute

to the Standard for Exchange of Product Model Data (STEP).

• Internet access: send an email message to "nptserver@cme.nist.gov". In the body of the message, type "help".

• Anonymous ftp: ftp ftp.cme.nist.gov, name: anonymous, password: <userid>,

files to be downloaded are located at "cd pub/step".

Weights and Measures Bulletin Board

Provides information on certificates of con- formance, software programs, publication

lists, and contacts.

• Modem access: (301) 869-1665 for 1200 baud (data bits: 8/no parity, stop bits: 1)

Computer Security Bulletin Board

Provides information on computer viruses, software reviews, computer security alerts, and publications.

• Modem access: (301) 948-5717 for 300, 1200, or 2400 baud; (301) 948-5140 for 9600 baud (data bits: 8/no parity or 7/even

parity, stop bits: 1)

• Internet access: telnet cs-bbs.ncsl. nist.gov or telnet 129.6.54.30. To download files, Internet users need to use ftp as follows:

t)'pe "ftp csrc.nist.gov" or "ftp 129.6.54.11." Log in to account "anonymous" using your

Internet address as the password. Computer

securit}' bulletin board files are located in

directory bbs. Or, telnet to the NIST Gopher

server. Type "telnet gopher.nist.gov."

Data Management Activities and

Applications Bulletin Board

Provides information on activities of the NIST Information Systems Engineering Division, which develops standards and provides

technical assistance to government and

industn.' in data administration, data management, technology, computer graphics,

and software standards validation.

• Modem access: (301) 948-2048 for 2400

baud, (301) 948-2059 for 300 or 1200 baud

(data bits: 8/no parity or 7/even parity, stop

bits: 1)

Fire Research Computer Bulletin Board

Features fire computer programs developed

by the Building and Fire Research Laboratory at NIST.

• Modem access: (301) 990-2272 for 300,

1200, 2400, or 96OO baud (data bits: 8/no

parit)', stop bits: 1)

North American Integrated Services Digital Network (ISDN) Users' Forum Bulletin Board

Provides minutes from the North American ISDN Users' Forum, meeting dates and agendas, user applications, analyses, and profiles. When prompted for password, type

"dialin."

• Modem access: (301) 869-7281 for 1200

or 2400 baud; (data bits: 8/no parity, stop

bits:l)

• Internet access: telnet 129.6.53-11
ADVANCED

TECHNOLOGY PROGRAM

Overview

Begun in 1990, the NIST Advanced Technology Program (ATP) promotes the economic

growth and competitiveness of U.S. business and industry by accelerating the develop- ment and commercialization of promising,

high-risk technologies with substantial

potential for enhancing U.S. economic

growth.

The program provides technology develop- ment funding through cooperative research agreements to single businesses or industryled joint ventures. Applicants must share the

costs of ATP projects.

Awards to individual companies are limited

to $2 million over 3 years and can be used

only for direct R&D costs. Awards to joint ventures can be for up to 5 years; joint ventures must provide more than 50 percent of the resources for the project. The ATP does not fund product development. It will support development of laboratoiy prototypes and proof of technical feasibility but not commercial prototypes or proof of commercial feasibility.

The ATP relies on the substantial involve- ment of industry to define and implement

R&D programs that are expected to have a substantial long-term economic impact.

The ATP selects specific projects through a rigorous competitive process that includes evaluation of both the technical and busi- ness merits of a project. The program has

received broad public support from groups such as the Advanced Technology Coalition, which represents over 30 major trade associations, professional societies, and hightechnology companies.

Essential Features

In designing the ATP, NIST looked to exist- ing large-scale R&D funding programs with

a reputation for results, particularly those of

the National Institutes of Health and the Defense Department's Advanced Research

Projects Agency. But the unique mission of the ATP—support for civilian technologies

in the nation's competitive interest

required some special features, which have become the hallmarks of the ATP and major

factors in its success.

Projects are selected on the basis of both

technical and business merit through a fair and rigorous competition.

After each proposal is screened for basic compliance with the ATP's requirements, it

is reviewed thoroughly by scientists and

engineers expert in the subject area—

a

common procedure for competitive grant programs. But ATP proposals that score well

in this technical review go on to afurther

evaluation of potential economic impact, evidence of significant commitment to the

project on the part of the proposer, and

other business-related factors affecting the likelihood that successful results will be commercialized.

The scientific and technical reviewers are primarily federal and academic experts to avoid conflict-of-interest problems and protect proprietary information. Business

reviews are conducted primarily by business

experts from the private sector who agree to avoid conflicts of interest and abide by nondisclosure requirements. Semifinalists

receive in-depth oral reviews. Proposals are ranked according to published selection criteria, and funding is awarded primarily on

the basis of the ranking. This merit-based

selection process has been fully tested and

refined and is essential to the effectiveness of

the ATP.

The ATP provides direct support to

for-profit companies of all sizes. Commercial organizations know best how

to commercialize a promising new technology. With this in mind, the ATP emphasizes

direct funding to for-profit companies.

Small, medium, and large companies, and

joint ventures led by two or more companies, are eligible for direct funding. Successful ATP project sponsors range in size from

start-up companies with a handful of employees to major industrial firms with

international scope. Universities, federal

laboratories, and non-profit institutions participate in many ATP projects, but as subcontractors or as members of joint ventures (although non-profit institutions may

administer joint ventures).

The ATP has a broad mission to promote

large economic benefits for the nation. The legislative mandate of the ATP is to promote "commercializing new scientific

discoveries rapidly" and "refining manufacturing practices." This offers tremendous

scope. The objective of some projects is to develop technologies that enable lower-cost, higher-quality, or faster-to-market products. The ultimate objective of others is to develop the know-how to provide new-tothe-world or radically improved products

and services. The ATP has a high potential

impact on U.S. economic growth because, unlike other federal technology programs, it makes investments explicitly for this reason

rather than for some other national goal.

The ATP Is market-oriented. While government provides the catalyst

and in many cases, critical technical support—industry conceives, manages, and

executes ATP projects. Management of

projects is geared to ensure that the work

performed is what industry believes should

be done and is what it can do best.

The ATP also emphasizes cost sharing

ATP recipients on average pay more than

half the total costs of the R&D. This helps

j ensure that companies have a vested interest j in the success of projects and in timely commercialization. At the same time, participation by small companies and start-ups is not precluded, because the single-applicant i requirement for cost sharing is that the com- j pany cover its indirect costs. Since most i

start-ups and small companies have low ii
ADVANCED TECHNOLOGY PROGRAM 1

1

PAST AWARD WINNERS

A listing of the research goals for past ATP award winners covers a ver\^ broad

array of cutting-edge technologies.

A sampling of 1992 winners includes multiyear awards to help fund:

• development of thick-film processing

technolog}' for radio-frequency components for communications equipment

(such as cellular telephone base sta- I

tions), based on high-temperature ' superconductors:

• development of technology' to "clean" y semiconductor wafers of trace metals,

particles, and surface damage using

dry, gas-phase agents in lieu of wet

chemicals;

• demonstration of a revolutionary' new

design for high-precision, multi-axis machine tools, based on an octahedron frame and a "Stewart platform" actuator;

• improvement in scientific understanding of the relationship between

processing, part geometry, raicrostructure, and part performance for fiber- reinforced molded thermoplastic parts, and application of this knowledge in an

integrated thermoplastic engineering

design morpholog)'.

indirect cost rates, this requirement is not

prohibitive.

The ATP has a comprehensive plan for monitoring and evaluating its performance. From the start, the ATP has strongly embraced program evaluation and considers it critical to the development and operation of a results-oriented, efficiently run

program. Early on, an evaluation plan was

developed and measurable goals were identified against which to track performance. As

• development of a microfabricated chip incorporating synthetic DNA probes,

together with necessary sensor and computer technology, for an automated, lowcost DNA sequencer;

• creation of a generic software technol- ogy to restore, enhance, or digitally refor- mat moving pictures, such as sequences from infrared, ultrasonic, or X-ray sensors or motion-picture films;

• application of newly developed pro- duction technologies to fabricate highefficiency long-lived, blue/green lasers and LEDs;

• development of new rapid solidifica- tion casting technology to produce thick ribbons of metallic glass sufficiently ductile to be used in high-power electric transformers and motors to reduce wasteful power loss;

• development of the methodology for producing animal-derived extracellular matrix materials as prosthetic materials

to support the regeneration of tissues and glands; and

• demonstration of the use of quantumlevel "electron trapping optical memory" in a prototype erasable optical disk

drive suitable for digital video recording

at substantially higher speeds and

greater densities than existing optical storage media.

the ATP strategic plan is updated, the evaluation plan is revised to ensure that it covers

all critical aspects of the program.

Economic Returns

Early results indicate that the ATP is

successfully improving the capability of the

nation's businesses to capture economic

returns from scientific and technological

innovations. (See success stories on page 6.) Two independent studies of projects funded

in FY 1991 revealed substantial, early beneficial impacts on participating companies,

including:

• expanded R&D activity, particularly the

ability to engage in high-risk, long-term

research with high-payoff potential;

• cost and time savings, improved productivity, and other benefits from industryindustry, industry-government, and

industry-university collaborations;

• improved competitive standing;

• formation of valuable strategic business

alliances;

• improved ability to attract investors;

• assistance in converting from defense to commercial applications; and

• acceleration of technology development,

leading to improved market share.

General and Program

Competitions

The NIST ATP office conducts competitions each year to review submitted proposals and

select grantees. The number of projects funded varies with the total program budget.

Two types of competitions are supported:

"general" and "program." General competitions are open to all technology areas. Past general competition awards have covered a

very broad spectrum of technologies in agriculture, biotechnology, microelectronics,

machine tools, advanced automotive manufacturing, advanced materials, information and communication technology, flat-panel

display manufacturing, and other areas.

(See box above.)

Each program competition focuses on a set

of technology and business goals. Program

competitions enable the ATP to channel

significant support to clusters of related

projects, each attacking a critical element and reaping the benefits of this synergy.
ADVANCED TECHNOLOGY PROGRAM

Key criteria for selecting program areas

include:

• potential U.S. economic impact, includ- ing the credibility of the program's pro- posed pathways to economic growth; the importance of the existing or potential

sector affected; and the probability of subsequent commercialization;

• good technical ideas that are "cutting

edge," high risk, strategically important,

and based on sound scientific and technical

concepts;

• strong industry commitment to participate, including breadth and depth of interest and willingness to share costs and to work with the government and other partners; and

• opportunity for ATP to make a major dif- ference by supporting work that is unique or complementary to other industrial and gov- ernment efforts, that offers timely and significant acceleration of research progress, and that requires a critical mass of funding.

Industry Input

In selecting these broad programmatic

areas, the ATP relies on its overall strategy

of drawing on industry's ideas. Setting research priorities is a constant, ongoing

process based on input from industry. Every program has a finite duration, so there is a constant turnover of programs as some are completed and others started.

Mechanisms for getting industry's input

include (among others):

• input from senior industiy technical and

business managers;

• input from industry associations, trade groups, and professional societies;

• ATP-sponsored technical workshops and

conferences; and

Beginning in FY 1994, NISI also plans to amplify the ATP's impact on the U.S. econ- omy with several new strategies.

It will take a more active role In building

cooperative programs among businesses,

universities, and government agencies. Because of its global view and broad sources

of information, the ATP is in a unique position to spot potentially advantageous alli- ances and bring them to the attention of its industrial partners. For example, the ATP

might bring to the attention of a joint venture an outside company whose proposed

work appears to mesh well with that of the

joint venture. Or the ATP might suggest a

strategic alliance between a single-company

applicant proposing to develop a new tech- nology and a potential end user of that tech- nology, if such an alliance would increase

the chances of a project's success.

Although the final decisions about such alli- ances will always lie with the companies,

recognizing such opportunities gives the program an additional tool to increase the chances of success for its projects and to exploit promising opportunities that emerge.

ATP w\\ assist companies in planning

for future commercialization and in developing linkages with investors. Many of the companies participating in the ATP—particularly small companies—are stronger in their R&D planning and implementation of the R&D plan than they are in

their business planning and implementation of that plan. The early-stage, prelimi- nary business plans developed by these companies in their ATP applications often lack sufficient detail to provide the clear path to commercialization required by the ATP and may jeopardize many highly promising projects. The ATP plans to contract with private firms to provide business development support to ATP-funded companies that need such assistance.

The commercialization assistance program

will be run initially on a trial basis. Its per- formance will be monitored and evaluated, and, if successful, it will be continued and

expanded to serve all companies that wish

to participate.

The program will intensify Its outreach

efforts. While well-known to most of the larger technology-oriented companies in the United States, the ATP is less well-known

or understood by thousands of small, entrepreneurial companies that play a critical role in technology development and

might benefit from its programs. To remedy

this, an intensified outreach and marketing program has been started to increase awareness of the program. The outreach program

will be coordinated closely with state and

local economic development organizations

that are in a good position to identify small companies that might have an interest in the ATP.

President Clinton has proposed major

increases in ATP funding to increase the number of awards made each year and the breadth of cutting-edge technologies covered. The proposed expansion will allow the program to have a truly national impact on economic growth. The program's ultimate

success, however, will depend on continued

contributions from U.S. industry in the form

of good technical ideas, a willingness to cost

share, and the successful commercialization

of new technologies developed with ATP

funding.

Contact: Advanced Technology Program

1-800-ATP-FUND (1-800-287-3863)

email: atp@micf.nist.gov

fax: (301) 926-9524 A430 Administration Building

'

• analysis of proposals submitted to ATP in previous competitions.
MANUFACTURING

EXTENSION PARTNERSHIP

Overview

The NIST Manufacturing Extension

Partnership (MEP) is a nationwide network

of organizations to support U.S.-based manufacturers in increasing their competitiveness nationally and internationally

through ongoing technological advancement. NIST is building and coordinating

the partnership to help smaller manufacturers tap into regional and national sources of information, knowledge, and insight into

the use of modem manufacturing and pro- duction technologies.

When fully developed, the partnership will meet President Clinton's call for the estab- lishment by NIST of "over 100 manufacturing extension centers nationwide by 1997 to

assist manufacturers to modernize their pro- duction capability."

The partnership includes four major elements:

• regionally based Manufacturing Technology Centers (MTCs), providing hands-on

technical assistance to small and mid-sized

manufacturers;

• smaller, satelhte operations called Manufacturing Outreach Centers, some affiliated with an MTC;

• the State Technology Extension Program

(STEP), providing grants to help states build the infrastructure needed for technol- ogy transfer efforts; and

• the Links Program to pull together

both electronically and otherwise—not

only the NIST affiliated offices but also all other federal, state, local, and university

technology transfer entities into one

national network.

The philosophy of the MEP is to take maxi- mum advantage of programs already in

place. It avoids duplication of efforts among

existing technology assistance organizations and concentrates on matching company needs to available help regardless of

the source.

Established in 1992, the MEP builds on the MTC and STEP programs, which were cre- ated under the Technology Competitiveness

Act of 1988.

Manufacturing Teciinology

Centers

Regionally located and managed centers

for transferring manufacturing technology,

the NIST MTCs provide major focal points

for the partnership. The MTCs are designed

to bridge a "technology gap" between

sources of improved manufacturing technol- ogy and the small and mid-sized companies

that need it. The MTCs draw on a wide

variety of technology sources, including

commercial firms, federal research and

development laboratories (such as NIST),

universities, and other research-oriented

organizations. They are established in areas with a relatively heavy concentration of

industrial firms.

Local management by a regionally based

sponsor allows each MTC to tailor its services to the requirements dictated by its loca- tion and the type of manufacturing in its

client base. In general, the MTCs provide a wide range of services, including individual

project engineering, training courses, demonstrations, and assistance in selecting and

using software and equipment.

Some of the most important services include

factory survey visits, technical training, and

direct help with the introduction of modern

manufacturing equipment. MTCs also provide access to management, financial,

MEP AND MTC CONTACTS

General Information: Michael A. Taback

Phil Nanzetta Midwest MTC

Manufacturing Extension Partnership 2901 Hubbard Rd.

(301) 975-5020 Ann Arbor, Mich. 48105

fax: (301) 963-6556 (313) 769-4377

email: mepinfo@micf.nist.gov B115 Polymer Building

Mark Tebbano

Northeast MTC

John J. Chernesky 385 Jordan Road

California MTC Troy, N.Y. 12180-8347

13430 Hawthorne Blvd. (518) 283-1010 Hawlhome, Calif. 90250

(310) 355-3060 Jim Bishop

Southeast MTC

George H. Sutherland P.O. Box 1149

Great Lakes MTC Columbia, S.C. 29202

Prospect Park Building (803) 252-6976 4600 Prospect Ave. Cleveland, Ohio 44103-4314

(216) 432-5300

Jan Pounds

Upper Midwest MTC

111 Third Ave., S., Suite 400 1

Paul E. Clay, Jr. Minneapolis, Minn. 55401 M

Mid-America MTC (612) 338-7722 .1

10561 Barkley, Suite 602

Overland Park, Kan. 66212

, (913) 649-4333

r
MANUFACTURING EXTENSION PARTNERSHIP

marketing, and training services through

linkages to other established programs such

as the Small Business Development Centers. The MTCs do not conduct research.

The MTCs generally provide facilities that demonstrate various types of computeraided design and manufacturing software. Some MTCs also offer hardware demonstration facilities, including automated metal working equipment (lathes and milling

machines), robotic, and state-of-the-art measuring equipment. (See MTC success

stories on page 6.)

Outreach Centers

Smaller than MTCs, Manufacturing Outreach Centers (MOCs) are a new element in the partnership. The MOCs also help manufacturers adopt appropriate, modern tech- nologies, but the services of an MOC

generally do not encompass the full breadth

of those available through the larger MTCs.

In general, MOCs are organized as pro- grams affiliated with existing technical or

training institutions such as community colleges, technical colleges, vocational institutions, university manufacturing centers, or

state technical assistance centers. MOCs are located in areas with smaller concentrations

of industry and focus on delivering services

to client firms out of reach of an MTC.

These smaller centers may be closely affili- ated with a host MTC, or may be inde- pendent, with access to technology and

management input from non-MTC sources.

NIST will accept proposals for new MTCs

and MOCs only in response to a specific

solicitation. As funds permit, a Request for Proposals is posted in the Federal Register.

All solicitations are open and competitive. Specific funding provisions (which may change

due to actions by the Congress) and evaluation criteria that apply to the specific solicitation appear in iho. Federal Register notice. In

general, proposals are evaluated on:

• knowledge of target firms in the proposed

region;

• linkages to sources of technology;

• technology delivery mechanisms; and

• management and financial plans.

Each MTC or MOC must be sponsored by a

U.S.-based, non-profit institution or organization, possibly a state government agency.

The local sponsor must contribute 50 percent

or more of the proposed center's capital and

annual operating and maintenance costs.

State Technology

Extension Program

The State Technology Extension Program

(STEP) works with states to develop the "infrastructure" for coordinated manufacturing extension and modernization pro- grams to serve the competitive needs of small and medium-sized businesses. The

program emphasizes statewide coordination

of existing and newly developed technology

assistance programs—such as NIST-funded MTCs and MOCs, university centers, or community college programs—and the develop- ment of complementaiy programs where

necessary to ensure more comprehensive

statewide delivery of services.

Typical examples might be creating a state- wide network of industrial extension agents

to provide advice and assistance on implementing new technologies, or a pilot project

to provide technology assistance to a particularly important industrial sector in the

state.

STEP grant projects must be sponsored by a

U.S.-based, non-profit institution or organization, possibly a state government agency. NIST accepts applications for STEP grants only in response to specific solicitations, which are published in the Federal

Register. All solicitations are open and

competitive.

STEP grants provide matching funds—the sponsor generally is required to put up at

least 50 percent of the cost of the proposed

project. Specific requirements will vary with each solicitation.

The LINKS Program

Under "LINKS," the Manufacturing Extension Partnership plans to identify sources of

assistance, information, and technology,

and "network" them in an open system of cooperative "links."

A key feature of LINKS will be a national

electronic network that connects all of the partnership's components, including MTCs,

MOCs, and other partnering organizations such as federal laboratories, universities, or other federal programs. This electronic net- work not only will provide for rapid communication but also will provide access to databases and information on a variety of

topics, including technologies available from different sources, best manufacturing

practices, and listings of technical experts.

Many of these databases exist in an inde- pendent fashion already and need only to be

tied into the unified LINKS network. In addition to the electronic network, LINKS also

will encompass joint projects that can serve extension efforts across the nation. Such

activities will include national interactive

satellite telecasts on topics of interest to manufacturers, national training programs

for extension agents, and development of common tools such as automated software

for assisting extension agents in assessing a manufacturer's operations.
MALCOLM BALDRIGE

NATIONAL QUALITY AWARD

First presented in 1988, the Malcolm

Baldrige National Qualit}- Award has

quickly become both the U.S. standard of

qualit\' achievement in industry and a comprehensive guide to quality improvement.

Congress established the award to raise awareness about quality management and

to recognize U.S. companies that have successful quality management systems. The

award was named in honor of Malcolm

Baldrige, who served as Secretary of Commerce from 1981 until his death in a rodeo

accident in 1987. Baldrige was a strong pro- ponent of qualit}^ management and helped

draft an early version of the legislation that eventually was named after him.

The award program, developed and managed by NIST with the cooperation and

financial support of the private sector, recognizes qualit)' achievements in three categories: manufacturing, service, and small

business. Up to two awards can be made in each category.

Applications for the award undergo a rigor- ous evaluation by an independent review board composed of quality experts from the

private and public sectors. Examiners conduct on-site reviews at firms that receive high scores after an initial screening. All applicants receive a written summar)' that

identifies their strengths and points out

areas for improvement.

Although the major focus of the award is on

results and customer satisfaction, it is not

given for specific products or services. To

win the award, a company must have a

world-class system for managing its processes and its people. This system should

I ensure continuous improvement in its product or service and provide a way of satisfy- ing and responding to its customers.

Tens of thousands of U.S. companies are now using the award's guidelines to evaluate their operations in seven key areas of quality management and performance.

• Leadership. Have senior leaders clearly defined the company's quality values, goals, and ways to achieve the goals? Are senior

executives personally involved? Does this involvement include communicating

quality excellence to groups outside the company?

• Information and analysis. Is the information used to guide the company's quality

management system reliable, timely, and

accessible?

• Strategic quality planning. How does the company plan to achieve or retain quality

leadership? How are these plans integrated

into its overall business planning?

• Human resource development and management. How does the company develop

the full potential of its work force?

• Management of process quality. How does

the company assure the quality of its goods

and services?

• Quality and operational results. 'What are

the company's quality and operational per- formance results and trends?

• Customer focus and satisfaction. What is

the company's relationship with its customers? How does the company satisfy current and future customer needs?

The results of these internal evaluations provide firms with a clear view of where they stand and of how far they must go to achieve world-class levels of quality,

Companies that apply for the National Quality Award must provide the details needed to prove achievement of world-class quality in

all seven areas. Facts, not flash, are needed

to make it through the tough screening

process.

Firms entering the competition pay a fee that covers the cost of the evaluation and

feedback reports. Profiles on the quality pro- grams of past award winners are available upon request. Copies of quality management guidelines and award applications are

also available.

Contact: NIST Office of Quality Programs

(301) 975-2036

email: oqp@micf.nist.gov

fax: (301) 948-3716 A526 Administration Building

PAST QUALITY

AWARD WINNERS

Winners of the Malcolm Baldrige National Quality Award include:

1993—Eastman Chemical Co. and Ames Rubber Corp. 1992—AT&T Network Systems

Group/Transmission Systems Business Unit, Texas Instruments Inc. Defense Systems and Electronics Group, AT&T Universal Card Services, The Ritz-Carton Hotel Co., and

Granite Rock Co.

1991 —Solectron Corp., Zytec Corp., and Marlow Industries.

1990—Cadillac Motor Car Divisioiis IBM Rochester, Federal Express

Corp., and Wallace Co. Inc.

1989—Milliken & Company and

Xerox Coip. Business Products and

Systems.

1988—Motorola Inc., Commercial

Nuclear Fuel Division of Westing- house Electric Corp., and Globe

Metallurgical Inc.

1
TECHNOLOGY SERVICES

SERVICES

AND PROGRAMS NIST provides a wide variety of services and programs to help U.S. industry

improve its international competitiveness, commercialize new technology,

and achieve total quality in all facets of business operations.

Companies spanning nearly all industrial sectors depend on the precision and

reliability of NIST measurement services and products to keep their production

processes running smoothly, efficiently, and safely. NIST reference materials,

data, and calibrations help industry

maintain quality control in the production of everything from aerospace alloys

to voltmeters to breakfast cereals.

Responding to increased emphasis on

quality standards in international markets, NIST provides information and

assistance to about 20,000 organizations

and individuals every year concerning

national and international voluntary

and regulatory product standards and

certification systems.

In addition, NIST offers a user-friendly

environment for businesses interested in cooperative research and development

efforts, NIST-developed technologies

available for license, guest researcher

opportunities, technical information, or

technical assessments.

Contact: David Edgerly, Acting Director (301) 975-4500

email; edgerly@raicf,nist.gov

fax: (301) 975-2183 A363 Physics Building

SERVICES AND PROGRAMS

1 6 Standards Analysis and Assistance 17 Standards Information Center 17 Weights and Measures

17 Standards Management

18 National Laboratory Accreditation

1 8 Office of Research and Technology

Application

1 8 Technology Development and Small Business Program

19 Standard Reference Data 19 Standard Reference Materials 20 Calibration Services 20 Technology Evaluation and Assessment

20 Information Services 20 Opportunities for Innovation

21 Metric Program

21 Small Business Innovation Research Program

STANDARDS ANALYSIS

AND ASSISTANCE

Standards Code and Information (SCI) Pro- gram staff assist federal agencies and industry with specific technically based trade

issues related to standards and conformity

assessment. SCI staff develop technical positions for U.S. negotiators in bilateral and

multilateral discussions; monitor and report on the adequacy of U.S. participation in international standardization efforts; handle complaints from U.S. industry repre- sentatives concerning foreign standards and

certification practices; and review and trans- mit U.S. comments on proposed foreign

regulations, especially under its cooperative

government-industry program with the Saudi Arabian Standards Organization. The

staff also monitor national and international developments related to standards and conformity assessment activities.

SCI staff hold voting membership in various national and international standards committees and participate in interagency task

forces and working groups to develop gov- ernment positions on major international standard-related developments, such as the formation of a European Single Market, the North American Free Trade Agreement, and

negotiations under the Standards Code. SCI

staff publish information detailing the standards and conformity assessment activities of U.S. private and government organizations as well as international and

regional organizations. The program also publishes other reports related to the ISO 9000 Standards Series, U.S. participation in international standardization, the formation of the European Single Market, and

other topics.
TECHNOLOGY SERVICES 17

SCI serves as the secretariat for the U.S. Interagenq' Committee on Standards Pohcy

and has pubUshed guideUnes on U.S. gov- ernment participation in international standards bodies, federal use of third party and self-certification, and its use of laborator\' accreditation. It has formed various working groups to deal with issues of multiagency concern related to standards and conformit}' assessment.

Contact: John L. Donaldson

(301) 975-4029

email: donaldso@micf.nist.gov A629 Administration Building

STANDARDS

INFORMATION CENTER

The NIST National Center for Standards and

Certification Information is the U.S. focal point for information on standardization programs and related activities at home and

abroad. Center staff provide information on

U.S., foreign, regional, and international voluntary standards bodies, as well as on

mandator,' government regulations and

conformit}' assessment procedures for nonagricultural products. As the U.S. member

of the International Organization for Standardization Information Network (ISONET), NIST has access to foreign national standards information through approximately 60 other ISONET members and the ISO

information center in Geneva, Switzerland. NIST also serves as the U.S. inquiry point under the General Agreement on Tariffs and

Trade (GATT) Agreement on Technical

Barriers to Trade.

At the center, NIST maintains an extensive

collection of reference materials, including

U.S. military and other federal government

specifications, U.S. industry and national

standards, international standards, and

selected foreign national standards. Staff members respond to requests for information either directly or by identifying the most appropriate source of information. They also prepare directories and indexes of speciahzed standards information, arrange

for translations of foreign standards, and

issue periodic publications explaining

ongoing developments in domestic and

international standards activities.

Two telephone hotlines located within the center offer weekly updates on draft Euro- pean standards [(301) 921-4164] and on

proposed foreign regulations that may significantly affect trade [(301) 975-4041].

Information for the latter hotline is supplied by the GATT Secretariat in Geneva.

Contact: JoAnne Overman

(301) 975-4037

email: overman@micf.nist.gov AI63 TRF Building

WEIGHTS AND MEASURES

Helping federal, state, and local govern- ments ensure equity in marketplace measurements is one of NIST's longest running and best-known programs. It includes an

accreditation program for state weights and

measures laboratories in the areas of mass,

length, and volume, as well as providing

test protocols, training, and ongoing laboratory assistance.

NIST sponsors the National Conference on

Weights and Measures, a standards develop- ment organization, which involves over 3,000 industry and regulatory agency representatives. Program staff manage the

National Type Evaluation Program, which,

at manufacturers' expense, evaluates commercial measuring devices against national and/or international standards. Staff pro- duce numerous training manuals, handbooks, and other publications, and they operate an electronic bulletin board to provide the weights and measures community

with a mechanism for rapidly exchanging

information. (See listing for bulletin board on page 9-)

Contact:

Carroll S. Brickenkamp

(301) 975-4004

email: brickamp@micf.nist.gov A617 Administration Building

STANDARDS MANAGEMENT

NIST manages U.S. technical representation and participation in the International Organization of Legal Metrology (OIML) and administers the U.S. Department of Commerce's Voluntary Product Standards

(VPS) program.

OIML is a treaty organization with a membership of 51 voting and 37 non-voting

nations. OIML's objective is to enhance

trade by harmonizing national regulations

governing performance requirements for measuring instruments used for equity in commerce, for assurance of public and

worker health and safety, and for protection

of the environment. To realize its objective, OIML develops International Recommendations and International Documents for adoption and use by member nations. These

publications include requirements for test- ing and verifying the performance of measuring instruments. In managing this program, NIST obtains technical advice and

support from U.S. trade associations, instru- ment manufacturers, academia, and federal and state regulatory agencies.
TECHNOLOGY SERVICES

Under the VPS program, NIST provides the

secretariat for the development and mainte- nance of voluntary standards for selected products, with the costs paid by proponent

trade associations or other groups. Current

standards concern softwood lumber, construction and industrial plywood, woodbased structural-use panels, and glass

bottles for carbonated soft drinks.

Contact: Samuel E. Chappell

(301) 975-4023

email: chappell@micf.nist.gov A625 Administration Building

NATIONAL LABORATORY

ACCREDITATION

The NIST National Voluntary Laboratory

Accreditation Program (NVLAP) rigorously evaluates the competencies and technical

qualifications of public and private laboratories for providing testing and calibration

services. An accredited laboratory must

meet all requirements of national consensus

standards as well as international accreditation requirements of the International Standards Organization (ISO Guides 25 and

related standards).

For a fee, NVLAP currently accredits qualified laboratories that offer services in the following testing areas: product testing

(acoustics, carpets, paints, paper, plumbing,

seals, sealants, insulation), computer net- works, construction products (cement, concrete, etc.), electromagnetic compatibility,

energy-efficient lighting, fasteners and metals (chemical, dimensional, metallurgical),

telecommunications, and personnel radiation dosimetry. Accreditation is also available in the following calibration areas: dimensional, electrical, radiation, mechanical, thermodynamics, and time and frequency.

Any interested laboratory, organization, or agency can apply for accreditation in these and other areas. Requests for expanded pro- gram ser/ices will be evaluated on a case- by-case basis. Among the many benefits of NVLAP accreditation are certification of proficiency with a quality-assurance check on

laboratory performance, substantive advice

for improving performance, and national

recognition of competency. Accreditation

also helps users—from industry, govern- ment, and elsewhere—identify providers of high-quality testing and calibration services.

The program staff publish an annual directory of NVLAP- accredited laboratories.

Co?itact:

Albert Tholen

(301) 975-4016

email: tholen@micf.nist.gov AI62 TRF Building

OFFICE OF RESEARCH AND

TECHNOLOGY APPLICATION

The Office of Research and Technology

Application assists U.S. industry in identifying, accessing, and applying NIST and other

federally developed technology. The staff

also participate in and develop workshops,

conferences, and seminars that bring federally developed technology to the attention of companies that can benefit from it.

The office staff works with federal, state, and local technology outreach and eco- nomic development programs, as well as professional and scientific societies and

trade associations, to help them assist industry with the application of NIST and other

federal technology. The staff can guide

industry and other customers to a spectrum

of technical assistance services, ranging from information, patents available for

license, cooperative research and develop- ment agreements, use of unique facilities, specialized technical workshops, and scientific and engineering expertise.

The office director is the NIST representative

to the Federal Laboratory Consortium.

Contact: Joseph G. Berke

(303) 497-7038

email: jberke@micf.nist.gov

Division 104.00

Boulder, Colo. 80303-3328

TECHNOLOGY

DEVELOPMENT AND SMALL

BUSINESS PROGRAM

The Technology Development and Small

Business Program serves as a central NIST

technology transfer office. The office helps

develop R&D relationships between NIST

and industry, and it is also responsible for patenting and licensing technologies

developed with NIST partners and by NIST

laboratories.

The office is the point of contact for U.S.- based organizations interested in:

• exploring the various ways of working

with or accessing NIST's R&D capabilities, including obtaining technical assistance from NIST experts in specific fields;

• setting up R&D partnerships with NIST

laboratories, such as bilateral or consortia cooperative R&D efforts, through cooperative research and development agreements

(CRADAs), domestic guest researcher agree- ments, or other formal arrangements;

• obtaining licensing rights to NISTpatented technologies; and
TECHNOLOGY SERVICES

• accessing NIST's world-class measure- ment facilities through facility use agreei ments or proprietary measurement

agreements.

i Working with NIST has helped individual

! U.S.-based firms leverage their R&D efforts,

I develop new products, improve production

, processes, improve quality control measurei raents, and enhance existing product per- formance. Collaboration with NIST has

helped consonia and other industrial groups to develop technical consensus;

I develop generic technologies with broad,

industr\'-wide applications; or pool a critical

! mass of industrial participants for effective technology implementation.

[ Contact: Bruce E. Mattson

(301) 975-3084

! email: mattson@micf.nist.gov B256 Physics Building

STANDARD REFERENCE

DATA

' Working closely with industry, NIST pro-

, vides well-documented numeric data to

scientists and engineers for use in technical

1 problem-solving, research, and develop- ment. These recommended values are based on data extracted from the world's litera-

( ture, assessed for reliability, and then evaluated to select the preferred value. The

I evaluations are carried out through a net-

• work of data centers, projects, grants, and

cooperative programs.

Standard Reference Data (SRD) have a variety of uses in industrial applications and

are available as databases for personal computers, as well as in other computerized

forms, and as publications. Common appli- cations include use for calibration points

(such as spectral wavelengths and transi- tion energies) and as input to the design of new processes and materials. Among the many subjects covered are analytical

chemistry, atomic and molecular physics, chemical kinetics, fluid mixtures, thermochemistry, materials properties, phase

equilibria, and biotechnology.

To increase the usefulness and accessibility of data, NIST has developed a series of per- sonal computer databases with interactive programs, search routines, and other calculational and graphical software features. Most databases are updated yearly, adding more data and more software capabilities.

Another major dissemination vehicle is the Journal ofPhysical and Chemical Refer- ence Data, a bimonthly journal published

jointly with the American Chemical Society

and the American Institute of Physics.

A free catalog of NIST SRD data products

and services is available.

Contact: Malcolm W. Chase

(301) 975-2200

email: chase@micf.nist.gov A323 Physics Building

STANDARD REFERENCE

MATERIALS

Now numbering more than 1,200 and steadily growing to meet the needs of industry. Standard Reference Materials (SRMs) are a

diverse collection of solids, liquids, and

gases certified for their chemical composition or physical properties. With an SRM,

companies can verify the accuracy of analytical or other measurement methods

under development or calibrate established measurement systems to ensure consistently accurate performance of equipment and

operators. Specific types of SRMs range from

linewidth standards for producing inte- grated circuits, to metal alloys for checking

quality control in steel production, to radio- pharmaceuticals for calibrating medical

equipment.

NIST's SRM catalog provides a complete list- ing of available reference materials along

with a description of their certified properties. In addition, the Handbookfor SRM

Users offers practical guidance on the use of the materials, describes the fundamental ele- ments and concepts of quality control and measurement processes, provides advice on

using control charts and statistical tools to evaluate measurement quality and uncertainty, and includes articles on quality assurance, sampling, and validation of

analytical instruments.

The SRM program staff also publish timely information on reference materials, offer telephone consultations on SRM uses, and

organize seminars to advise industry on SRM applications.

Contact: Thomas E. Gills

(301) 975-2016

email: gillst@micf.nist.gov 215 Engineering Mechanics Building
20 TECHNOLOGY SERVICES

CALIBRATION SERVICES

NIST provides more than 500 different services to ensure that manufacturers and other

users of precision instruments achieve measurements of the highest possible quality. These services, which satisfy the most demanding and explicit requirements, link a customer's precision equipment or in- house standards to national standards. For

calibrations and special tests, NIST personnel check, adjust, or characterize an instru- ment, device, or set of in-house, or transfer, standards. Customers are assured that measurements are consistent with national standards and adequate for their intended use. Besides individual equipment items, NIST measurement assurance programs calibrate

entire measurement systems.

The full range of NIST calibration services ensures the accuracy and compatibility of measurements used in day-to-day quality- control applications. The services, available

for a fee, encompass seven major areas: dimensional measurements; mechanical,

including flow, acoustic, and ultrasonic; thermodynamics; optical radiation; ioniz- ing radiation; electromagnetics, including

direct current, alternating current, radio frequency, and microwave; and time and

frequency.

The program staff publish a regularly

updated catalog describing available services, fee schedules, and detailed descriptions

of calibration protocols. Staff members

offer telephone consultations on the use of

services and on the importance of traceability to national standards, and they make

presentations to industry groups and other

organizations.

Contact:

Joe D. Simmons

(301) 975-2002

email: simmons@micf.nist.gov

A104 TRF Building

TECHNOLOGY EVALUATION

AND ASSESSMENT

NIST offers technology evaluation and consulting services, on a cost-reimbursement

basis, to client institutions or organizations. Evaluation is free where the technology

qualifies for consideration under the EnergyRelated Inventions Program. All technologies are evaluated on the basis of technical and commercial feasibility, and all evaluations are held in strict confidence.

In cooperation with the U.S. Department of Energy (DOE), NIST evaluates new product

or process ideas for their potential to improve energy efficiency, reduce energy

costs, or increase energy supply. Inventions may be submitted to the program at any

stage of development. All inventors are informed, in detail, of the results of the free evaluations.

Inventions that satisfy NIST criteria are rec- ommended to DOE, which may decide to support development and commercialization. Since 1975, DOE has awarded nearly

$35 million to move NIST-recommended

inventions closer to commercialization. In

addition, inventors may use the NIST recom- mendation report to help attract private investment capital.

Contact: George Lewett

(301) 975-5500

email: lewett@micf.nist.gov

A115TRF Building

INFORMATION SERVICES

The Office of Information Services maintains a comprehensive international collection of information in scientific disciplines such as metrology, mathematics, physical

sciences, computer science, and materials

science. The staff serve the technical infor- mation needs of NIST scientists and engineers and communicate the results of NIST

research to scientific and engineering communities worldwide.

The office staff participate in national and

international publications and technical information networks and consortia, as well

as a document exchange program to ensure

that NIST publications are available to

scholars, scientists, engineers, industry

researchers, and others. An inquiries service and information staff assist the public in obtaining information about past and

present NIST programs, publications, and

special projects.

Contact: Sami Klein (301) 975-2790

email: klein@enh.nist.gov

EI06 Administration Building

Reference Librarians (301) 975-3052

email: reflib@enh.nist.gov E107 Administration Building

OPPORTUNITIES FOR

INNOVATION

The Opportunities for Innovation (OFI) Program assists small to medium-sized

technology-based companies in the formation of R&D strategic partnerships with leading manufacturing corporations. To

accomplish this goal, a series of regional OFI workshops is organized by NIST in cooperation with states and regional partners to
TECHNOLOGY SERVICES

; promote deployment of advanced technolo-

; gies by small to medium-sized businesses,

i These workshops cover selected technolo-

' gies, such as sensors, advanced manufacturing, biotechnolog}', pollution prevention,

optoelectronics, and others, where R&D

; opportunities exist for small firms. The

' workshops also provide a forum for

I exchange of information on "niche" tech1 nologies available from the participating

; smaller businesses and on opportunities for

joint R&D partnerships with the leading

manufacturing corporations. The technical

part of the OF! workshops is supported by

OFI monographs written by industrial

: experts and consultants commissioned by

NIST. Information on financing opportuni-

' ties for small and medium-sized businesses through the Small Business Administration

! and state-based resources is also provided to

'; participants of OFI workshops.

Contact:

I Jarda Ulbrecht

' (301) 975-5511

; email: jju@micf.nist.gov A363 Physics Building

METRIC PROGRAM

The NIST Metric Program helps implement

the national policy to establish the metric system as the preferred system of weights

and measures for U.S. trade and commerce. The Metric Program coordinates the metric

transition activities of all federal agencies.

It provides leadership and assistance on metric conversion and metric usage to federal agencies, state and local governments,

standards organizations, trade associations, and businesses. The program also disseminates educational information to increase understanding of the metric system and to

identify and remove barriers to metric usage.

The 1988 amendments to the Metric Conversion Act of 1975 require federal agencies to use the metric system in procurements,

grants, and other business activities. Executive Order 12770, "Metric Usage in Federal Government Programs," issued in 1991,

reaffirms the legislation by instructing the

federal agencies to implement formal plans

for using the metric system and by requiring the federal agencies to report metric

progress annually. The order authorizes the

Secretary of Commerce to direct and coordi- nate the federal agency metric transition and to assess progress in annual reports to

the President. The NIST Metric Program

carries out the direction and coordination

responsibilities of the Secretary.

Because of the metric system's importance

as an international standard, its use in product design, manufacture, marketing, and

labeling is essential for U.S. industry's success in the global marketplace. The use of

the metric system in federal agency pro- grams relating to trade, industry, and commerce is intended to support industry's

voluntary adoption of metric usage and to help catalyze a broader metric transition that will achieve the full economic benefits

of metric usage.

Contact: Gary P. Carver

(301) 975-3690

email; carver@micf.nist.gov A146 TRF Building

SMALL BUSINESS

INNOVATION RESEARCH

PROGRAM

The Small Business Innovation Research

(SBIR) Program provides funding on a competitive basis to small businesses that can

carry out research on topics of interest identified by participating federal agencies.

Each year, the Department of Commerce

issues a list of recommended R&D topics. There are two phases of awards: In Phase I, awardees can receive up to $100,000 to

establish the technical feasibility of a pro- posed project. Successful Phase I partici- pants may compete in Phase II for up to $750,000 to support further development of

the work. Funds available at each agency

for SBIR are directly tied to the agency's extramural research funding level. Accordingly, NIST's program has been expanding

in recent years.

Contact: Norman Taylor

(301) 975-4517 A363 Physics Building
ELECTRONICS AND ELECTRICAL

ENGINEERING LABORATORY

In consultation with industry, NIST

electronics and electrical engineering

researchers tailor Institute programs to meet the most critical measurement

needs in the manufacture of semiconductor, magnetic, radio-frequency, microwave, optical, optoelectronic, and

superconducting products, as well as

electrical power systems.

These researchers develop improvements

in quality control and cost effectiveness

for both current and next-generation semiconductors; produce methods that help increase the efficiency of optical

fiber networks; and operate specialized

computer facilities to develop new standards and performance measures for flat-panel displays and high-definition

television systems.

They also conduct fundamental studies on promising future technologies such as high-temperature superconductors and

hybrid computer chips that utilize both

electronic and lightwave signals.

This laboratory provides the fundamental

basis for all electrical measurements in the United States.

^Contact: Judson C. French, Director (301) 975-2220

email: french@micf.nist.gov

|fax: (301) 975-4091 B358 Metrology Building

COOPERATIVE RESEARCH

OPPORTUNITIES

Electricity

23 Video Processing 23 Metrology for Flat-Panel Displays 23 Automated Electronics Manufacturing Program

24 Electrical Metrology witfi Optical Sensors 24 Gaseous Electronics 24 Synthesis of Precise Signals 24 Testing Electronic Systems

25 Fast Pulse and Waveform Acquisition Standards 25 Self-Calibrating Systems 25 Advanced AC-DC Voltage and Current Measurements

25 Josepfison-Effect Voltage Standards 26 Resistance Standards and Materials 26 Quantum Hall Effect 26 Applying High-Tc Superconductors

to Precision Electrical Measurements

Semiconductor Electronics

27 Silicon Characterization 27 Compound Semiconductors and Semiconductor Microstructures 27 Molecular Beam Epitaxy 28 Semiconductor Spectroscopy 28 Semiconductor Devices 28 Power Semiconductor Electronics 29 Semiconductor Thin-Film Metrology 29 Advanced Integrated-Circuit Test

Structure Metrology 29 Integrated Measurement Systems

29 Building-ln Reliability

Electromagnetic Fields

30 Advanced Microwave/Milllmeter-Wave

Metrology 30 Electromagnetic Characterization

of Materials

31 Electromagnetic Interference and

Compatibility

31 Antenna Measurements

Electromagnetic Technology

31 Magnetics 32 Superconductor Measurements

32 Optical Electronics 32 Lovi/-Temperature Electronics

RESEARCH FACILITIES

33 Semiconductor Processing Researcfi Laboratory 34 Superconductor Integrated-Circuit Fabrication Laboratory 34 High-Voltage Measurement Facility 34 Transistor Safe Operation Test System

35 High-Accuracy Elllpsometer 35 Near-Field Scanning Facility for Antenna Measurements

36 Ground Screen Antenna Range

36 Mode-Stirred Chambers

37 Transverse Electromagnetic Ceils 37 Electromagnetic Anecfiolc Chamber
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

COOPERATIVE RESEARCH

OPPORTUNITIES

ELECTRICITY

' Division Contact:

Oskars Petersons

^ (301) 975-2400

ij email: opete@raicf.nist.gov

fax: (301) 926-3972

I Bl66 Metroiog)- Building

VIDEO PROCESSING

1 Data compression, motion encoding, scanrate conversion, and other video processing

research topics are being explored at NIST

j using a massively parallel video supercomj puter, the Princeton Engine. The Princeton

' Engine, developed by the David Samoff

Research Center, Princeton, N.J., is a l4-giga-instruction-per-second imageprocessing system capable of simulating

video rate signals, including conventional

National Television Standard Code and

high-definition video, in real time. Because

the engine is programmable, it can be used

to evaluate software prototypes of video processing components rapidly and at a cost below that of building hardware.

The Princeton Engine consists of 1,024 parallel processors, where each 1 6-bit processor has its own ALU, multiplier, and 128 kilobytes of local memon.'. Each processor operates on one picture element per video scan

line, and all processors execute the "same"

instructions. Wideband input and output

channels accept and produce a number of analog and digital video formats. For many

applications, video data can be processed and output at the same rate as they are

input, that is, in real time. For longer algo- rithms up to 7 seconds of video data may be

acquired in real time, stored in local memory, and, once processed, displayed at the

original data rate.

Programming is accomplished using a

subset of the C language having special constructions for parallel operation. Video

recorders, multiscan monitors, highdefinition monitors, and additional video support equipment are available.

NIST researchers are interested in using the Princeton Engine laboratory' for a wide variet\- of collaborative research projects. Such

collaborations would focus on precompetitive research with broad applications in advancing the state of the art in highdefinition systems.

Contact: Bruce F. Field

(301) 975-4230

email: field@eeel.nist.gov

B344 Metrolog)' Building

METROLOGY FOR

FLAT-PANEL DISPLAYS

Researchers at NIST are developing the measurement technology for the characterization of advanced image display

systems. A set of meaningful performance

specifications is needed that can be used to

assess display quality and that can be

applied across the wide spectrum of display

technologies that either are available or will

shortly become available. Display quality

issues are not simply a matter of light measurement, power efficiency, display environ- ment, or signal quality. Rather, many of

these factors act in concert to affect display

quality, with an important addition—the complexities of human visual perception. Research topics include the development of radiometric and colorimetric measurements

of emissive and non-emissive displays, the

automation of such measurements,

investigation of the visual perception of the

eye, and modeling of display characteristics using the Princeton Engine video supercomputer.

Contact: Bruce F. Field

(301) 975-4230

email: field@eeel.nist.gov

Edward F. Kelley (301) 975-3842

email: kelley@eeel.nist.gov

B344 Metrology Building

AUTOMATED ELECTRONICS

MANUFACTURING

PROGRAM

The Automated Electronics Manufacturing

Program (AEMP) at NIST is working with

industry' to build the infrastructure for an

electronic marketplace and to demonstrate and apply this technology to the electronics

industry. AEMP researchers are leading a demonstration team within the national industry/government Electronic Commerce

of Component Information (ECCI) pro- gram. The objective of ECCI is to show the

viability of today's technology coupled with emerging standards to broker electronic component information across a national information highway. Another enabling

technology for electronic commerce is a complete and consistent suite of standards

for the exchange of electronic product data

descriptions. AEMP is involved in efforts to "harmonize" existing, overlapping standards (such as EDIF and ICES), to help

industry test for compliance with those

standards, and to work with industry to

develop standards in critical areas where none exist.

Contact: Barbara L.M. Goldstein

(301) 975-2304

email: goldstein@eeel.nist.gov

B344 Metrology Building
24 ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

ELECTRICAL IVIETROLOGY

WITH OPTICAL SENSORS

Measurements involving high voltage or combined high-voltage and high-speed phe- nomena are costly and difficult to perform

because of the cost of high-voltage sensors, high-voltage insulation requirements, and

electromagnetic interference. Yet nearly

every item installed in an electric power

generation and distribution network must

undergo acceptance tests at high voltage and withstand accidental high-voltage

surges as well as natural ones.

Optical and electro-optical techniques offer

possibilities of overcoming the disadvantages of conventional sensors. Researchers

at NIST are developing electro-optical

methods as part of a program to develop

theory, methods, and physical standards

for measuring electrical quantities and

phenomena in advanced high-voltage/

high-power systems.

Experimental research includes develop- ment of Kerr effect techniques to measure

high-voltage transients and electric fields

in insulation systems. Devices based on the Faraday effect in optical fibers and glass rods are evaluated as substitutes for conventional current transfers and shunts in high-voltage applications. High-speed

photography, image-preserving optical

delay systems, optical multichannel analyzers, lasers, and sensitive detectors are used

to study electrical breakdown phenomena in

real time involving nanosecond time resolutions. Theoretical studies are focused on the use of finite-element code for electric-field computation and computer-aided data

acquisition and analysis.

Anticipated benefits include measurements

and tests to evaluate more reliably the per- formance of high-voltage power equipment

and thus increase its efficiency. Better understanding of safety margins and on-line performance monitoring will enable the equipment to operate at higher loads and

facilitate the introduction of new, more

effective, and environmentally more accept- able insulation materials. The direct beneficiaries will be the electric utihty industry,

its equipment suppliers, and the pulsed- power community that uses high-voltage

techniques in high-energy physics, space, and defense applications.

Contact: Alan H. Cookson

(301) 975-2418

email: cookson@eeel.nist.gov

Bl64 Metrology Building

GASEOUS ELECTRONICS

NIST scientists are developing measurement

methods to characterize gaseous dielectrics

for high-voltage power systems. Emphasis is on investigation of phenomena that affect

reliability and safety associated with operation of gas-insulated systems, such as pro- duction of toxic byproducts in electrical

discharges. Theoretical work addresses Boltzmann equilibrium statistics, chemical

kinetics code, and computer-aided data

acquisition and analysis. Experimental

work focuses on high-voltage ac and dc

tests, gas chromatograph and mass

spectrometer techniques for chemical

characterization, and partial discharge measurements. Researchers are investigating rf discharges used for processing electronic materials, including the study of plasma diagnostics and kinetics as they

apply to the plasma processing of semi- conductor materials.

Contact: Richard J. Van Brunt

(301) 975-2403

email: vanbrunt@eeel.nist.gov

B344 Metrology Building

SYNTHESIS OF PRECISE

SIGNALS

NIST is conducting both theoretical and

experimental research on the synthesis of precision ac waveforms for use in ac voltage standards operating nominally below

10 MHz and producing both sinusoidal and

arbitrary waveforms. The theoretical work

includes Walsh functions and Fourier analysis, time-domain analysis, and precision RMS-to-dc conversion techniques. Experi- mental work involves high-speed, high- accuracy digital-to-analog conversion;

precision, high-speed switching; assembly

and interpretive-level programming for hardware control; and wideband, fastsettling amplifiers.

Contact:

Barry A. Bell

(301) 975-2402

email: bbell@micf.nist.gov BI62 Metrology Building

TESTING ELECTRONIC

SYSTEMS

NIST scientists are developing new testing

approaches for electronic systems to mini- mize the attendant testing costs while assur- ing product quality. Program emphasis is on development and application of generic

error modeling methods for describing the systems to be tested. Once an accurate model is available, it can predict the per- formance of a device based on the fewest

possible number of tests. Theoretical work

centers on dimensionality selection for empirical models to minimize prediction

errors, and on the assignment of uncertainties and confidence limits when making predictions based on empirical models. Results
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

of this work are being used by the semiconductor industry' to reduce the costs of testing mixed-signal integrated circuits.

I Contact:

I T. Michael Souders

' f301) 975-2406

email: souders@eeel.nist.gov BI62 Metrology Building

I FAST PULSE AND

WAVEFORM ACQUISITION

STANDARDS

\, NISI has an active program to provide a

' basis for characterizing both the time

; domain and frequency domain performance

i of sampling and digitizing systems, includ- ing A/D converters, sampling oscilloscopes,

. and waveform recorders. Theoretical and

(experimental research establishes test methods, reference waveforms, and state-of-theart sampling technology to support these

\ systems. Research areas include optoelectronic and electro-optical techniques for sampling and pulse generation in the 1- to 5-picosecond regime; advanced signal processing methods, including deconvolution,

phase-plane compensation and spectral esti- mation; and ultrahigh accuracy techniques

to support modem sigma-delta sampling

technology.

Contact:

T. Michael Souders

(301) 975-2406

email: souders@eeel.nist.gov 'BI62 Metrology- Building

SELF-CALIBRATING

SYSTEMS

Self-calibration features are ubiquitous in imodem instrumentation, but their overall

effects are often poorly understood. NISI

; researchers are developing a model-based

j theory of self-calibrating systems that

' should lead to more efficient and accurate implementation, better understanding, and

j Irealistic programs for calibration support.

Major goals are the development of a highlevel representation scheme capable of describing the data characteristics and infor- mation flow of self-calibrating systems, and

the development of an analysis engine to extract performance information.

Contact:

T. Michael Souders

(301) 975-2406

email: souders@eeel.nist.gov

BI62 Metrology Building

ADVANCED AC-DC VOLTAGE

AND CURRENT

MEASUREMENTS

Thermal voltage and current converters

offer the most accurate and broadband

method for measuring ac voltage and

current for applications in communications, power generation, aerospace, and

defense. Thermal transfer standards are calibrated by NIST in terms of reference converters, which have themselves been characterized by reference to the NIST primary

standards—special multijunction thermal

converters whose performance is known.

These primary and working standards in common use throughout the metrolog}'

community employ thermal converters fabri- cated from wire elements. Researchers at NIST are studying new methods for the manufacture of film thermal converter

structures made by the use of photolithography on silicon substrates. The application of

this new technology may result in improved

performance and reduction in the cost of thermal converters.

Contact:: Joseph R. Kinard

(301) 975-4250

email: kinard@eeel.nist.gov

Norman B. Belecki

(301) 975-4223

email: nbele@micf.nist.gov

B146 Metrology Building

JOSEPHSON-EFFECT

VOLTAGE STANDARDS

High- accuracy voltage-standard systems have proliferated among many industrial, government, and international standards

laboratories with the advent of the Josephson-array device. Within this NIST

laboratory, there are three array voltage- standard systems in operation, including a

fully automated 10-V array system. Guest

researchers can gain hands-on experience with array system operation and verification, as well as cooperate on studies into both precision voltage metrology and

Josephson-array physics.

The metrology goals are to improve meas- urement precision to better than one part

in 10^ in applications of direct system-to- system intercomparisons and lab-to-lab volt

transfers, achieve greater reliability in auto- mation algorithms, and further the develop- ment of solid-state reference standards and

precision digital voltmeters.

The physics research addresses the effects of electromagnetic noise on the stability and accuracy of the Josephson quantizedvoltage steps, studies the boundaries of chaotic behavior in junction-junction interactions, and explores other possible array

device applications, such as the generation

of ac signals through frequency modulation

of the millimeter-wave drive frequency.

Contact: Alan F. Clark

(301) 975-2139

email: clark@eeel.nist.gov Richard L. Steiner

(301) 975-4226

email: steiner@eeel.nist.gov

B258 Metrology Building
26 ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

RESISTANCE STANDARDS

AND MATERIALS

Component precision resistors of both film and wire construction have found wide- spread use as references and dividers in precision instrumentation, such as digital multimeters and calibrators. The quality of

these resistors and their level of immunity

to the effects of environmental parameters, such as temperature and mechanical shock, have enabled the 3-month performance of

these instruments to begin to approach that

of the standards most commonly used to

calibrate them. This fact and the desirability of calibrating such instruments where

they will be used has heightened the need

for a next generation of resistance standards—standards whose performance

in adverse conditions would eclipse that

of existing standards in a laboratory environment.

NIST scientists are beginning a program to develop new standards with sub-ppm per- formance, both short- and long-term, under

field conditions. To do so, the electrical/ physical properties of a number of alloys are being investigated, and new resistor designs

are being formulated and tested. Future

efforts will investigate metallurgical tech- niques such as rapid quenching, ion implantation in semiconductors and glasses

for resistors > 10'' Q, and Evanohm or Nichrome film deposition on Si substrates. The desired output will be fixed-value standards in the range from 1 Q to 10 " t2 with sub-ppm per year drift rates, temperature

coefficients less than 0.1 ppm/°C, and low power and voltage coefficients. A metallurgical facility with the capability of monitoring the electrical properties of materials during annealing and a silicon processing

facility are available along with access to precision resistance measurement systems and the national resistance standards.

Contact: Ronald F. Dziuba

(301) 975-4239

email: dziuba@eeel.nist.gov

Norman B. Belecki (301) 975-4223

email: nbele@micf.nist.gov

B146 Metrology Building

QUANTUM HALL EFFECT

The quantum Hall effect now provides the

basis for the national unit of resistance. The

realization of the resistance standard in the laboratory presents many interesting problems; researchers at NIST are investigating

the physical principles underlying the effect, understanding sample-specific artifacts, and improving the measurement systems. Research is being conducted on the range of parameters over which the quantum Hall

effect provides the most accurate and repro- ducible standard of resistance.

Using GaAs heterostructures grown at NIST, researchers are using a dedicated

class- 10 clean room facility to investigate

different methods of making contacts to the

devices that will have very low resistances

(in the milli-ohm range) even at temperatures below 4.2 K and in high magnetic

fields.

Research also is being conducted on deter- mining the degree to which the device resis- tance is independent of its material and

manufacturing variables by comparing the

resistances of devices made from different

materials.

Recent research at NIST has opened up the

possibility that quantum Hall devices may

be a source of very-high-frequency phonons

when large current densities are passed

through the devices.

NIST researchers also are working to improve and simplify the measurement

systems used to calibrate resistors; a new

He-3 refrigerator and l6-T magnet facility have been developed for use with a new

cryogenic current comparator. This enabled

the accuracy of NIST calibrations to be

increased severalfold.

Contact: Marvin E. Cage

(301) 975-4224

email: cage@eeel.nist.gov

Edwin R. Williams

(301) 975-4206

email: williams@eeel.nist.gov

B258 Metrology Building

APPLYING HIGH-Tc

SUPERCONDUCTORS TO

PRECISION ELECTRICAL

MEASUREMENTS

NIST and other national standards laborato^'

ries for years have used cryogenic current comparators (CCCs) to make ratio measure- ments of voltage, current, and resistance with accuracies of 0.01 ppm or better. This approach has not found widespread commercial use because the cryogenic current comparator must be operated at liquidhelium temperatures, which presents a variety of operational difficulties. Moreover,

existing comparators are working prototype;'

rather than completed instrumentation sys-'

terns and, accordingly, are difficult to use.

Recent advances in superconductivity tech

nology have made the application of hightemperature superconductors practical. In

at least one case, an integrated circuit SQUID magnetometer, similar to devices used in CCCs to detect low levels of magnetic flux, has been built that operates at liquid-nitrogen temperatures. Thus, the po'

sibility for developing a commercial instru ment based on a CCC has now been opened

Such an instrument might be run with a

refrigerator at liquid-nitrogen temperature
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

This development and the possibilit)' of commercialization make it feasible to automate

the basic CCC design, which then will be more attractive for general calibration use. NIST scientists are now engaged in designing, building, and testing CCCs to support measurements of the new national resistance standards based on the quantized Hall

effect. This involves establishing a few select

ratios that range from 1:1 to 100:1. Future

efforts will include the development of CCCs

with selectable ratios over a somewhat

larger range.

Contact: Ronald F. Dziuba

(301) 975-4239

email: dziuba@eeel.nist.gov

Randolph E. Elraquist

(301) 975-6591

email: elmquist@eeel.nist.gov Norman B. Belecki

(301) 975-4223

email: nbele@micf.nist.gov

B146 Metrology Building

SEMICONDUCTOR

.ELECTRONICS

Division Contact: Frank F. Oettinger

f(301) 975-2054

I email: oettinger@sed.eeel.nist.gov

.:fax: (301) 948-4081

.'B344 Technology' Building

SILICON

! CHARACTERIZATION

IMNIST conducts research on semiconductor

' materials, processes, devices, and integrated

circuits to provide the necessary' basis for

! understanding measurement-related

requirements in semiconductor technology.

As part of this program, NIST scientists are

jjji using electrical, optical, and X-ray methods

i 'to study the resistivit}', dopant distribution,

ifiiand concentration of electrically inactive

I

i impurities, such as carbon and oxygen

in silicon. They are developing new or improved techniques by two- and three- dimensional mapping of these properties, refining the quantitative aspects of existing

methods, and developing non-destructive methods. Measurement techniques include

four-probe, spreading resistance, and

capacitance-voltage; Fourier transform

infrared spectroscopy; deep-level transient spectroscopy; and photoluminescence.

Contact: James R. Ehrstein

(301) 975-2060

email: ehrstein@sed.eeel.nist.gov Paul M. Amirtharaj

(301) 975-5974

email: amirtharaj @sed.eeel. nist.gov

A305 Technology Building

COMPOUND

SEMICONDUCTORS AND

SEMICONDUCTOR

MICROSTRUCTURES

The electronics industry now requires light- emitting and detection devices and ultra- high-speed structures that cannot be

fabricated from silicon. Compound semi- conductors including III-V binaries and

alloys, such as GaAs and AlGaAs, and II-VI

materials, such as CdTe and HgCdTe, are employed to complement the functions of

the Si circuitry. In addition, special and

unique electronic and structural properties can be obtained using artificially structured

materials, such as quantum wells and superlattices. Efficient exploitation of these novel materials and structures in the production

of useful electronic devices requires detailed

studies to understand the fundamental physics involved as well as the characterization

of possible device structures.

Scientists and engineers at NIST currently

are involved in producing and characterizing III-V binai7 and alloy materials and device structures using optical

techniques such as ellipsometry, photoreflectance, Raman scattering, and photoluminescence; variable temperature and variable magnetic field Hall-effect measurements;

resistivity measurements; capacitancevoltage profiling; deep-level transient spectroscopy; photoconductivity and X-ray

diffraction; and rocking curve studies with

conventional and synchrotron radiation

sources.

Contact: David G. Seller (301) 975-2081

email: seiler@sed.eeel.nist.gov James R. Ehrstein (301) 975-2060

email: ehrstein@sed.eeel.nist.gov

A305 Technology Building

MOLECULAR BEAM

EPITAXY

The controlled growth capabilities of molecular beam epitaxy (MBE) have

resulted in the fabrication of structures that

represent a new class of semiconductors

with properties that do not exist in bulk

materials. The MBE program at NIST

includes the growth and characterization of GaAs and AlGaAs layers, as well as the growth of heterostructures for superlattice

and quantum confinement studies. Scientists examine fundamental properties of the MBE layers using photoluminescence, deeplevel transient spectroscopy. Hall effect, secondary-ion mass spectroscopy, and

in-situ reflection high-energy electron diffraction (RHEED). Studies are under way to

correlate RHEED oscillation intensity measurements with material quality and growth

parameters. The MBE program is an inter-
28 ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

active effort, and cooperative research opportunities exist in a variety of materials characterization and device-related areas.

Contact: James Comas

(301) 975-2061

email: comas@micf.nist.gov

Wen F. Tseng

(301) 975-5291

email: tseng@sed.eeel.nist.gov

Joseph G. Pellegrino (301) 975-2123

email: pellegrino@sed.eeel.nist.gov

A305 Technology Building

SEMICONDUCTOR

SPECTROSCOPY

Spectroscopic studies in the visible and near

visible regions of the electromagnetic spec- trum are invaluable in investigating both

materials- and device-related properties.

The ability to couple to electronic states of

interest in device applications and their nondestructive nature make spectroscopic analyses attractive research and analytical tools. Studies currently under way at NIST focus on the electronic and structural behavior of semiconductor materials, such as Si, GaAs, and HgCdTe; microstructures, including

quantum wells and superlattices; and photonic and electronic devices. Excellent spectroscopic facilities are available to perform

high-resolution photoluminescence, Raman

scattering, reflection, absorption, spectro- scopic ellipsometry, and modulation

spectroscopic measurements, such as elec- troreflectance and photoreflectance. The

equipment used includes one of the highest

resolution ellipsometers in the world,

excitation lasers, spectrometers, cryostats, and associated optical and electronic instruments.

Contact: Paul M. Amirtharaj

(301) 975-5974

email: amirtharaj@sed.eeel.nist.gov

David G. Seller (301) 975-2081

email: seiler@sed.eeel.nist.gov

A305 Technology Building

SEMICONDUCTOR DEVICES

To develop physically sound techniques for characterizing, analyzing, and predicting

the operation and performance of semiconductor devices, NIST researchers are designing and improving measurement methods

to determine critical device parameters for both VLSI-scale and power devices.

Research in device modeling includes two- dimensional silicon MOSFET and GaAs MESFET model development and investigations into the validity of the physical

assumptions typically employed in silicon bipolar and GaAs device models. Theoretical research is carried out on the transport of ions and electrons in semiconductors for improved process modeling, and experimental research on the nature and characterization of electronic states in oxides and

at oxide/semiconductor interfaces is under

way. NIST scientists are developing methods

for physical and electrical measurements of device and material parameters that are

critical for verifying the accuracy and validity of device models. In addition, they are researching the electrical and thermal properties of power semiconductor devices.

Contact: David L, Blackburn

(301) 975-2068

email: davebl@micf.nist.gov 33 10 Technology Building

POWER SEMICONDUCTOR

ELECTRONICS

Power electronics is an enabling infrastruc- ture technology that significantly enhances

capabilities across a wide range of industrial sectors, including manufacturing,

transportation, consumer electronics, defense, and information systems. NIST

researchers are working on semiconductor

device problems as they relate to the design

and reliability of power electronic systems. For instance, electrothermal power device models are being developed and verified for use in power system simulators. Included is the novel concept of physics-based, compact

thermal models for device packages and

heat sinks for inclusion in the simulators.

Verified parameter extraction procedures

are an important part of the effort. The

results of this task will lead to improved

circuit and system design capability for systems such as electric vehicles and large and small motor drives. Another task is development of characterization methods

for the thermal properties and limits of safe operation of devices such as the IGBT, power ICs, and power-circuit modules. Laboratory capabilities include extensive electrical and thermal characterization facilities, infrared microradiometry, and a unique

non-destructive test system. Successful completion of this work should lead to more

reliable power devices and to improved measurement methods in general.

Contact:

'

David L. Blackburn ( (301) 975-2068

email: davebl@micf.nist.gov

Allen R. Hefner, Jr. (301) 975-2071

email: hefner@sed.eeel.nist.gov

B310 Technology Building
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

' SEMICONDUCTOR

THIN-FILM METROLOGY

' The electricaL optical and mechanical

properties of thin films are important in many phases of semiconductor manufactur-

' ing and in device and circuit operation. NISI researchers are developing procedures

for measuring these properties and devising

artifacts for instrument calibration. Currently, staff members are improving ellip- sometric measurements of thickness for thin

films on semiconductors, specifically Si02 on Si. Other films of interest include

I nitrides, thick oxides, layered structures important in silicon circuit manufacturing, and photoresist. For qualit}' control and

technology transfer, it is essential that all

' steps of the IC production process be absolutely calibrated. NIST provides artifacts traceable to national standards of length

that industry uses to calibrate its equipment

and processes.

Contact: Nhan Van Nguyen

i (301) 975-2044

email: nguyen@sed.eeel.nist.gov Barbara Belzer (301) 975-2248

email: belzer@sed.eeel.nist.gov

8310 Technology Building

ADVANCED INTEGRATEDCIRCUIT TEST STRUCTURE

1 METROLOGY

Integrated-circuit (IC) test structures and

test methods developed by NIST are used

^'Widely by the semiconductor industry and

other government agencies. These devices can be used to characterize IC manufacturI' ing processes, to evaluate the effectiveness

j'of semiconductor processing equipment, to

;iobtain crucial parameters for process or cir- cuit simulators, to perform product acceptance tests, and to determine the reliability

•iof the products manufactured. NIST work

involves test structure design, modeling,

data acquisition, and data analysis. Insti- tute engineers are investigating pattern rec- ognition techniques for the rapid diagnosis

of IC manufacturing processes. They

also are developing new structures for nanometer-level metrology and for estab- lishing methods to determine the reliability of thin films used in state-of-the-art microcircuits.

Contact: Loren W. Linholm

email: linholm@sed.eeel.nist.gov Michael W. Cresswell email: cresswell@sed.eeel.nist.gov

Harr\'A. Schafft email: schafft@sed.eeel.nist.gov

(301) 975-2052 B360 Technology' Building

INTEGRATED

MEASUREMENT SYSTEMS

Microelectromechanical systems (MEMS)

incorporate new sensors and actuators in integrated-circuit (IC) technology for lowcost and portable precision measurement

applications. Areas of interest include

standardization, environmental monitoring, and control in biomedical, military, and space applications. Systems aspects address the development of new circuits for

control, communication, self-test, and self- calibration of complex micromechanicalbased systems. Standards aspects address

the need for test structures and methods

for evaluation and reliability of micro- mechanical-based devices. Custom and commercial foundry-compatible techniques are developed and utilized for device fabrication, and computer-aided design methods

and standard design libraries are developed

for rapid commercialization and technology

transfer.

This new MEMS fabrication methodology is used to produce integrated microsensor

systems that can be used to monitor and

control IC processing. An increasing

demand is placed on microelectronic

devices to be more reliable, especially as

their size decreases and the density of these devices increases on an IC chip. Reliability characterization based on post-manufacture

stress tests and burn-in cycles becomes

extremely undesirable in terms of test time and cost for these advanced ICs. A new

approach for reliability characterization is

to monitor and control the process parameters that affect the reliability of the device. Currently, NIST is developing an integrated microsensor system for the in-situ monitoring of a sputter metallization process. This system will provide real-time measurements

of metallization resistivity and substrate temperature that can be used as feedback to control the process. Other microsensor structures for measuring gas composition also are being developed.

Contact: Michael Gaitan

(301) 975-2070

email: gaitan@sed.eeel.nist.gov

John Suehle

(301) 975-2247

email: suehle@sed.eeel.nist.gov

B36O Technology Building

BUILDING-IN RELIABILITY

Advances in microelectronic circuit density, complexity, and reliability, as well as greater demands for ever shorter times to develop and market new products, are forc- ing the U.S. semiconductor industry to use a new approach to reliability. The traditional,

reactive approach of using screen and

accelerated-stress tests is becoming increasingly impractical to assure the reliability of microelectronic products because too many

parts and too much time will soon be

required.
30 ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

NIST is working with the semiconductor

industiy to implement the new "Building-hi

Reliability Approach," which emphasizes

understanding and controlling the causes

for reduced reliability. A pilot project is under way to demonstrate how this new

approach can be used to identify and control key input process parameters affecting

product reliability. The process being investi- gated is one for depositing the thin-film metal used to make electrical interconnects

in microelectronic circuits. The microelec- tromechanical systems (MEMS) fabrication methodology is being used to develop an

integrated microsensor system for in-situ monitoring of the thin-film metal sputter- ing process used widely in the industiy. The

system is being designed to provide real- time measurements of metal film resistivity and substrate temperature that can be used

as feedback to control and to identify key

input parameters of the sputtering process.

NIST has begun this project in response to industry-identified needs for guidance and

for "success stories" that can be used to develop and implement this approach

expeditiously.

Contact: Harry A, Schafft (301) 975-2234

email: schafft@sed.eeel.nist.gov

John S. Suehle

(301) 975-2247

email: suehle@sed.eeel.nist.gov

B360 Technology Building

ELECTROIVIAGNETIC

FIELDS

Division Contact:

Allen C. Newell

(303) 497-3131

email: newell@micf.nist.gov

fax: (303) 497-3122

Division 813.00

Boulder, Colo. 80303-3328

ADVANCED MICROWAVE/

MILLIMETER-WAVE

METROLOGY

Rapidly developing microwave technology

requires the support of advanced measure- ments and standards. The microwave industry and the Department of Defense rely on NIST for calibrations of transfer standards

to provide accurate, traceable measure- ments required for product development,

performance evaluation, quality assurance, and commercial interchangeability.

For measurements of attenuation as well as impedance and scattering parameters, NIST

researchers have developed automated and

highly accurate techniques using six-port network analyzers. Accurate techniques for microwave power measurement using pri- mary microcalori meters and transfer standards, as well iis noise measurement based on the evaluation of standard noise sources, have been developed. Calibration services based upon these methods form a critical element in the nation's microwave electronics infrastructure.

To support the latest technologies, measure- ment capabilities are currently being enhanced. Power and impedance standards

are being greatly improved. Advanced wide- band six-port automatic network analyzers and techniques for measuring the noise fig- ure of active devices are under development. Measurement services are being extended to cover millimeter waves as well as subminiature coaxial connectors.

The group also develops metrology for industrial use, particularly in microelectronics. NIST researchers support the monolithic microwave integrated circuit and highspeed microelectronics industries through

research and the development of on-wafer

metrology. This work is supported by fabri- cation facilities, which include the facility

to manufacture coplanar and microstrip

calibration standards. Industrial applications of the results are ensured by close col- laboration with industry.

Contact: Robert M. Judish

(303) 497-3380

email: judish@central.bldrdoc.gov

Division 813.06

Allen C. Newell

(303) 497-3131

email: newell@micf.nist.gov

Division 813.00

Boulder, Colo. 80303-3328

ELECTROMAGNETIC

CHARACTERIZATION OF

MATERIALS

It is widely recognized that critical needs

exist for accurate data on the electromagnetic properties of certain materials used

extensively throughout the aerospace, microwave, electronics, and communications industries. The Electromagnetic Prop- j

erties of Materials Program at NIST seeks to I'

support industry by evaluating and improving measurement techniques, by providing

well-characterized reference materials, by

providing measurement services, and by

organizing measurement intercomparisons. Current capabilities include room temperature measurements of complex permittivity and permeability for bulk materials in the

spectral range, 100 kHz to 18 GHz, as well
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

|s high-precision cavity measurements of

Ipw-loss dielectrics near 10 GHz. NISI plans p extend measurement capabilities, for

|oth bulk and thin-film materials, into the bilhmeter range with coverage at elevated

ind cryogenic temperatures. Adequate and

Dore accurate materials characterization

lata will help industry' obtain optimal com-

'onent and system performance with greatly educed costs for corrective redesign.

'Contact: jidrewG. Repjar

:303) 497-5703

mail: repjar@micf.nist.gov

:£laude M. Weil 303) 497-5305

tmail: repjar@micf.nist.gov

division 813.08

,;oulder, Colo. 80303-3328

ELECTROMAGNETIC

INTERFERENCE AND

COMPATIBILITY

silST researchers are engaged in a wide

ange of projects aimed at quantifying elec- "omagnetic interference (EMI) and electro- lagnetic compatibility (EMC). One thrust

f the NISI work is to develop measurement

echniques and methodologies for measurag emission of unintentional radiation

i'ora electronic devices. Another aspect

!nder active investigation is the susceptibilly of electronic equipment to such radiaJ'on. The researchers are identifying and

icfining quantities that characterize the suseptibility- of a device and then developing

iiethods to measure those quantities. Suc-

.essful completion of this research should

lesult in the development of standards and

-measurement techniques for EMI and EMC

fiat are meaningful, technically practical, nd reliable. These techniques could then

be incorporated into voluntary standards by both U.S. and international standards

organizations.

Contact: Motohisa Kanda

(303) 497-5320

email: mkanda@micf.nist.gov

Division 813.07

Boulder, Colo. 80303-3328

ANTENNA

MEASUREMENTS

Researchers at NIST are developing reliable techniques and standards for measuring key

performance parameters of antennas and

components used with satellites. Earth

terminals, radars, and communications

systems. Near-field scanning is now used

routinely to characterize microwave and

millimeter-wave antennas. NIST researchers

are focusing on developing and implementing techniques to correct for errors in the scan surfaces and applying all near-field techniques to higher frequencies. Software

for the analysis of spherical near-field data

recently has been rewritten and improved. Other research areas include spacecraft and

phased-array antenna measurements, antenna diagnostics using near-field tech- niques, and antenna systems measurements

using celestial radio sources.

Contact: Andrew G. Repjar

(303) 497-5703

email: repjar@micf.nist.gov

Carl F. Stubenrauch

(303) 497-3927

Division 813.08

Boulder, Colo. 80303-3328

ELECTROMAGNETIC

TECHNOLOGY

Division Contact: Robert A. Kamper

(303) 497-3535

email: kamper@micf.mst.gov

fax: (303) 497-3066

Division 814.00

Boulder, Colo. 80303-3328

MAGNETICS

Magnetic materials have a great variety of

uses, such as in magnetic recording and

other computer-related applications, trans- formers, motors, sensors, and medical sys- tems. The trend in magnetic recording is toward high information density and higher

access speed, both of which are increasing

rapidly. As information storage becomes more dense, smaller read/write heads are required. The materials properties for very small components change drastically from

properties in the bulk. New measurement

methods are required to determine these properties in very small specimens and on

very small scales.

NIST researchers address these problems by

developing methods to characterize magnetic materials such as ferromagnetic and

magnetoresistive films, recording tapes and

disks, ferromagnetic steels, very weakly magnetic alloys, amorphous ribbons, spin

glasses, ferrites, and permanent magnets.

Structures of interest include magnetic thin

films, coupled magnetic layers and multilayers, and particulate composite materials. New, improved, and traditional techniques

are used, including vibrating-sample,

SQUID, and Hall-probe magnetometers, as well as alternating-field techniques such as ac susceptometry, B-H loops, and rf permeability. Novel imaging by magnetic force microscopy is used extensively. Attention is given to calibration accuracy, measurement
32 ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

precision, and instrument development. The

research has broad application, from magnetic technologies to basic understanding of materials properties.

Co7itact: Fred Fickett (303) 497-3785

email: fickett@micf.nist.gov

Division 814.05

Boulder, Colo. 80303-3328

SUPERCONDUCTOR

MEASUREMENTS

Recent advances in superconductivity have

resulted in a critical need for measurement

technology to characterize the different

types of superconductors, which now range from very fine filament alloy conductors

used in the Superconducting Super Collider cables to a variety of high-temperature ceramic superconductors (HIS). Research programs at NIST involve measurement

techniques for critical current, critical magnetic field, ac losses, magnetic hysteresis, and electron tunneling. Specialized

experimental work is being performed to determine the effect of strain on the super- conducting properties of low-temperature

commercial conductors and HTS materials.

The correlation between deposition parameters of laser- ablated HTS thin films and the

resulting morphology and quality of the films is studied, hi collaboration with industry, the resistance of contacts between normal metals and high-temperature super- conductors was decreased by eight orders of magnitude, allowing accurate measure- ments of the magnetic-field dependence of the critical current. A standard for measuring critical current in low-temperature

superconductors has been published

through ASTM, and a Standard Reference

Material has been produced for use in cali- brating critical-current measurement apparatus. A new reference material for large currents is being developed.

Contact:

Fred Fickett (303) 497-3785

email: fickett@micf.nist.gov

Division 814.05

Boulder, Colo. 80303-3328

OPTICAL ELECTRONICS

The accurate characterization of optical

electronic devices is crucial to several industries, including lightwave communications,

lasers, and optical fiber sensors. NIST staff are developing metrology to support light- wave communications in areas of optical

fibers, sources, detectors, and integrated

optic components. Measurement capabilities are aimed at evaluating components at the research and commercial level. Semiconductor materials are grown by chemical beam epitaxy, and fabrication facilities

exist for integrated optics on glass and crystalline substrates. National standards have been established for evaluating laser power and energy meters; high-speed detectors are characterized by a number of time and fre- quency domain methods. Novel sensors based on optical fibers are being used to

detect voltages, currents, and other physical

quantities. Cooperative research with NIST

in the above areas results in new measure- ment procedures, new technology, and cali- bration services. The nature of this NIST

research is applied, so opportunities for commercialization are excellent.

Contact: Aaron A. Sanders

(303) 497-5341

email: aas@micf.nist.gov

Division 814.02

Boulder, Colo. 80303-3328

LOW-TEMPERATURE

ELECTRONICS

Cryogenic, and especially superconducting,

electronics provide remarkably high speed

and sensitivity, coupled with exceptionally

low-power dissipation. NIST uses the unequaled performance of low-temperature

electronics to supply U.S. industry with

standards and measurement capabilities ahead of state-of-the-art conventional,

room-temperature technologies. NIST maintains a world-leading program through its complete facility for fabricating large-scale

superconducting and normal metal inte- grated circuits. A similar capability has been developed for circuits of growing

complexity made from high -temperature ceramic superconductors.

NIST research spans the range from very basic studies of ultra-small tunnel junctions

to a superconducting series array voltage standard in operation at almost three dozen

laboratories around the world. The work has

established numerous world performance

records over the years with such devices as analog-to-digital converters, samplers, elec- trometers, microwave and infrared detectors, lithographed antennas, and magnetic

flux detectors using SQUIDs. NIST efforts support private industry through cooperative research and assistance with measure- ment techniques.

Contact: Richard E. Harris

(303) 497-3776

email: rharris@micf.nist.gov

Division 814.03

Boulder, Colo. 80303-3328 .

...
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

RESEARCH

FACILITIES

SEMICONDUCTOR

PROCESSING RESEARCH

JVBORATORY

s integrated circuit (IC) sizes increase to

aore than 1 cm' and feature sizes within

le circuits decrease to less than 1 |im, critial demands are placed on the measureaent capabilit}' required to control and

aonitor IC fabrication successfully. To meet

le demand, NISI researchers are develop-

(ig state-of-the-art measurement proceures for microelectronics manufacturing.

Ihe semiconductor processing research

iborator)' provides a qualit}' physical envi- ronment for a variet)' of research projects in ^miconductor microelectronics as well as

1 other areas of physics, chemistr)', and marrials research. The laborator}' facilities are

ised for projects addressing many areas of emiconductor materials and processes, hcluding process control and metrolog)',

oaterials characterization, and the use of

ntegrated circuit materials and processes

pr novel applications.

(he laboratory complex occupies about 72 square meters, approximately half of

{'j^hich is composed of clean rooms. Within

i ne clean rooms, work areas are maintained

\X class 10 or better. The facilit}' is designed

jo that the work areas can be modified

j'asily to accommodate the frequent equipaent and other changes required by

esearch.

APABILITIES

I the laboratory' has a complete capability for

I Z fabrication. Principal processing and

ijnalytical equipment is listed below. The

japabilities are expanded and improved

ontinuously to meet the technological

hallenges.

• Diffusion, Oxidation, and Annealing. Six furnace tubes for up to 75-mra-diameter

wafers and nine tubes for up to 100-mmdiameter wafers.

• Photolithography. Research mask aligner

(proximit}' and contact) for wafers up to 100 ram in diameter and irregularly shaped

samples and lOx direct-step-on wafer sys- tem for 75-mm-diameter wafers. Photoresist spin coating and developing and related chemical processing, including oxygen plasma stripping.

• Film Deposition. Low-pressure chemical

vapor deposition systems for depositing

silicon nitride, polysihcon, and low- temperature silicon dioxide. Rf and dc vac- uum sputtering of metals and dielectrics. Electron beam and hot filament vacuum

evaporation of metals.

• Etching. Wet and dry etching processes. Reactive ion beam etcher capable of ion milling and chemical etching with gases such as freon, sulfur hexafluoride, ox}'gen,

and chlorine.

• Ion Implantation. Multipurpose 200-KeV

ion implanter.

• Analytical Measurements. Thin-film

reflectometry and other thickness measurements, optical microscopy, and grooving and staining. Automated and manual probe

stations for current-voltage measurements and capacitance measurements as a function of voltage, frequency, and time.

APPLICATIONS

Small quantities of specialized semiconductor test specimens, experimental samples,

prototype devices, and processed materials can be produced. The processes and process- ing equipment can be monitored during

operation to study the process chemistry and

physics. The effects of variations in operat- ing conditions and process gases and chemical purities can be investigated. Research is performed under well-controlled conditions.

A research-oriented facility, the laboratory

is not designed to produce large-scale ICs or

similar complex structures. Rather the laboratory emphasizes breadth and flexibility in order to support a wide variety of projects.

Currently, research projects address many

aspects of microelectronic processing steps and materials as well as silicon micro- machining. Examples include: nietal-oxide- semiconductor measurements; metal- semiconductor specific contact resistivity; uniformity of resistivity, ion-implanted

dopant density, surface potential, and inter- face state density; characterization of deposited insulating films on silicon carbide; ionization and activation of ion-implanted

species in semiconductors as a function of annealing temperature; electrical tech- niques for dopant profiling and leakage current measurements; and processing effects on silicon-on-insulator materials. A simple

CMOS process has been established.

AVAILABILITY

Laboratory staff welcome collaborative research projects consistent with the research goals of the NIST semiconductor program. Work is performed in cooperation

with the technical staff of the laboratory.

The most productive arrangements begin

with development of a research plan with

specific goals. The commitment of knowledgeable researchers to work closely with NIST staff and the provision of equipment

and other needed resources are required. Because hazardous materials are present, laboratory staff must supervise all research

activities.

Contact: Donald B. Novotny

(301) 975-2699

email: novotny@sed.eeel.nist.gov B3 10 Technology Building
34 ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

SUPERCONDUCTOR

INTEGRATED-CIRCUIT

FABRICATION LABORATORY

NISI maintains a complete fabrication laboratory for superconducting integrated

circuits. Devices employing both low- and

high-temperature superconductors are supported. Demonstrated capabilities include

the fabrication of 20,000-junction Joseph- son 10-volt array standards, using niobium

trilayer technology. Individual facilities include a digital pattern generator, a wafer

stepper having submicrometer resolution, laboratory-scale electron-beam lithography

apparatus, thin-film deposition and etching

systems, and requisite accompanying proc- essing tools. These facilities are available on

a limited basis in support of collaborative research with NIST.

Contact: Richard E. Harris

(303) 497-3776

email: rharris@micf.nist.gov

Division 814.03

Boulder, Colo. 80303-3328

HIGH-VOLTAGE

MEASUREMENT FACILITY

NIST maintains a high-voltage measure- ment facility in which researchers develop and evaluate measurement techniques needed for the efficient, reliable transmission and distribution of electric power

(including for defense purposes). Major programs now being pursued using this

facility are the measurement of transient voltages and currents; the development of techniques to quantify pre-breakdown and

breakdown phenomena in liquid and gas- eous dielectrics; and the measurement of low-frequency electric and magnetic fields.

CAPABILITIES With existing power sources, direct voltages

of 300 kV, 60-Hz alternating voltages of 175 kV, and standard lightning impulses of 500 kV can be produced. Selected waveforms, such as microsecond duration trap- ezoidal waveforms up to 300 kV and gated 60-Hz waveforms up to 100 kV, are also

available. Supporting equipment includes high-voltage standard capacitors rated at 200 kV; high- accuracy, current-comparator

bridges for 60-Hz measurements; a preci- sion dc divider rated at 200 kV; dividers to measure standard lightning impulses up to 1-MV peak; partial discharge measurement

systems; high-speed cameras and support- ing optical equipment (including an

image-preserving optical delay); a computer-controlled system to measure the

electric field in transformer oil; a gas- chromatograph/mass-spectrometer system; and a system to produce a known electric

field and current density in air at atmospheric pressure.

Measurement systems are available to measure pulsed voltages and currents with characteristic times ranging from nanoseconds

to milliseconds. These systems include Rogowski coils and capacitive probes as well

as the necessary recording equipment to acquire and store digital records. These conventional measurement systems are supplemented by optical sensors and couplers.

APPLICATIONS

• Instrumentation and Component Evaluation. Impulse, ac, and dc dividers; electric and magnetic field meters; capacitors; transformers; lightning arresters; and ion

counters,

• Dielectrics Research and Development.

Chemical degradation studies; measure- ment of the fundamental processes of dis- charge initiation; onset and magnitude of

partial discharges; space charge measurement; and streamer propagation studies.

AVAILABILITY The high-voltage facility is used by NIST

staff and by guest researchers from industry,

universities, and other federal agencies. Use

of the facilities must be scheduled in advance. Because of the complexity of the system, typical use of the facility is in the form of a collaborative investigation with NIST staff.

Contact: WiUiam E. Anderson

(301) 975-2403

email: wander@micf.nist.gov

B344 Metrology Building

TRANSISTOR SAFE

OPERATION TEST SYSTEM

A unique test system that automatically determines the turn-off limits for bipolar

transistors and MOS-gated devices (MOSFETs and IGBTs) is available to scientists, engineers, and technicians for characterizing devices at currents between 1 and

100 A and voltages from 60 to 2000 V. The

system is non-destructive for all bipolar

devices and often non-destructive for MOS-gated devices. The system works by

turning on the device (either with a gate voltage or current) into an inductive load and then turning off the device by reversing

the gate current or voltage. The drain or collector voltage rises rapidly as the current attempts to decrease because of the inductive load. The predominant failure mode in

this application is a rapid collapse of the voltage and associated current construction,- which usually causes device failure due to , melting. The system senses the voltage collapse and removes all of the current from \, the device in less than 50 ns, thus prevent- •

ing destruction in bipolars and either pre- venting or reducing damage in MOS-gated

devices. The system is under the control of z computer via an IEEE 488 interface. Tests can be set up and run automatically;
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

ij: non-destructive tests, an entire area of

fe operation using a single device can be

•|jnd in a few minutes.

j\ntact:

iivid W. Beming

01) 975-2069

pail: beming@sed.eeel.nist.gov

j 10 Technology Building

IGH-ACCURACY

LLIPSOMETER

lipsometr)' is an important non5tructive optical technique used through-

-\X the semiconductor industrv^ in deter- ming critical thicknesses and uniformities

Pa variety of semiconductor materials. The

gh-accuracy, single-wavelength ellipsome-

.f at NIST has been used primarily in the

rtification of Standard Reference Mateils (SRMs) in the 2530 series. These SRMs

'e certified for measured ellipsometric

irameters A and as well as the derived

ickness and refractive index of a range of

,iicon-di oxide layer thicknesses on a sili- n substrate. This unique instrument is pable of making measurements at a mullicit)' of incident angles with an accuracy

i position to within ± 0.004°. Current proj-

:s utilizing this capabilitv' include the contiuing certification of these SRMs as well

a variety of projects that observe the

i€Ct of various growth techniques of icon dioxide on silicon, different prepara-

-!'ns of the silicon substrate prior to oxida-

[•n, alternative methods of treating the Mcon-dioxide surface prior to measureint, and long-term effects on the quality

f the oxides. Extension of these efforts as

2y pertain to other semiconductor systems

jplanned. NIST welcomes the opportunity to collaborate on projects related to the current studies and to provide a meas- urement capability that is truly unique.

Contact: Barbara Belzer

(301) 975-2248

email: belzer@sed.eeel.nist.gov

David Blackburn

(301) 975-2068

email: davebl@micf.nist.gov

B310 Technology Building

NEAR-FIELD SCANNING

FACILITY FOR ANTENNA

MEASUREMENTS

This automated facility is designed to measure the near-zone phase and amplitude

distributions of the fields radiated from an antenna under test. Mathematical transfor- mations are used to calculate the desired antenna characteristics.

CAPABILITIES

Near-field data can be obtained over planar,

qlindrical, and spherical surfaces; the pla- nar technique is the most popular. Efficient computer programs are available for processing the large quantities of data required.

When operated in the planar mode, the

facility is capable of measuring over a 4.5-m X 4.5-m area with probe position

errors of less than ±0.01 cm. Improved

position accuracy is possible with further alignment, especially over smaller areas. Antennas with apertures up to about 3 m in diameter can be measured with a single

scan. The facility has been used successfully

over the frequency range 750 MHz to 75 GHz, It incorporates provisions for scanning larger antennas in segments.

APPLICATIONS

• Antenna Characteristics. The facility is used primarily for determining the gain,

pattern, and polarization of antennas.

Accuracies are typically ±0.15 dB for absolute gain and ±0.10 dB/dB for polarization

axial ratio. Patterns can be obtained down

to the -50 dB to -60 dB levels with side lobe accuracy typically about ±1.0 dB at the 40 dB level. (The exact uncertainties depend on the frequency, type, size of antenna, and other factors.) Near-field data

also can be used to compute near-field inter- actions (such as mutual coupling) of anten- nas and radiated field distributions in the near zone.

• Antenna Diagnostics. Near-field scanning

is also a valuable tool for identifying prob- lems and for achieving optimal perform- ance of various types of antenna systems. It has been used to advantage in locating

faulty elements in phased-array antennas and for adjusting feed systems to obtain the proper illumination function at the main

reflector. Phase contour plots of the nearfield data also can be used to determine surface imperfections in reflectors used for antennas or compact ranges.

• Probe Calibrations. A spherical probe

calibration facility serves as a far-field range for measuring the receiving characteristics of probes used to obtain near-field

data. These measurements are required to determine the probe coefficients, which, in

turn, are used to calculate accurate, probecorrected, far-field gain and pattern

characteristics of an antenna.

AVAILABILITY Two kinds of arrangements can be made to use this facility. NIST staff can perform

specified tests or measurements on a re- imbursable basis. In this case, the customer

has no direct use of the facility; all measure- ments are performed by NIST staff and the customer is issued a test report. As an

alternative, work may be performed on a

cooperative basis with NIST staff. This arrangement permits the user the advantage

of developing firsthand knowledge of the measurement processes, and the user is

responsible in large part for the accuracy of

test results. In either case, arrangements
36 ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

need to be made well in advance, and

reimbursement is required for the facility use and time of NISI staff involved.

Contact: Andrew G. Repjar

(303) 497-5703

email: repjar@micf.nist.gov

Division 813.08

Boulder, Colo. 80303-3328

AVAILABILITY

This facility is used heavily in performing

calibrations for industry and other govern- ment agencies. It is available for inde- pendent or collaborative work.

Contact: Motohisa Kanda

(303) 497-5320

email: mkanda@micf.nist.gov

Division 813.07

Boulder, Colo. 80303-3328

MODE-STIRRED CHAMBERS

NIST researchers have designed and constructed mode-stirred (reverberating) chambers to measure radiated electromagnetic

emissions, susceptibility of electronic equip- ment, and shielding effectiveness of materials and cable/connector assemblies. A

mode-stirred chamber is an electrically

large (in terms of wavelength), highquality cavity whose boundary conditions

are varied by means of a rotating conductive tuner or stirrer. The time-averaged field

inside such a cavity, when a sufficient number of modes are excited, is formed by uni- formly distributed plane waves coming from

all directions. This causes the polarization

of the field to vary randomly, hence elimi- nating the need for, or the utility of, physical rotation of test objects in the field. A

microwave oven is a simple example of a mode-stirred chamber without measure- ment support instrumentation.

CAPABILITIES The mode-stirred chamber simulates nearfield conditions for tests at frequencies from

200 MHz to 40 GHz. High-level test fields (up to 1000 V/m) can be generated efficiently over a large test volume in the chamber, or the chamber can be used to measure

low-level radiated emissions (total radiated power down to -100 dBm) from equipment

under test with minor instrumentation

changes. Equipment as large as

1.5 m X 2.0 m X 3.0 m can be tested.

APPLICATIONS t In addition to performing radiated-emission '

or susceptibility measurements of electronic ^' equipment, the mode-stirred chambers can r measure the shielding effectiveness of gas- '

keting, composites, and other materials j used for radio-frequency shielding applicaj tions. The chambers also can be used to

( measure the shielding effectiveness of wir- i ing harnesses and electrical cables, connec-

] tors, and assemblies.

| LIMITATIONS The usable lower frequency is limited by ; insufficient mode density, tuner effectiveness, and ability to excite uniformly all modes in the chamber. These factors are a ; function of both chamber geometry and i

size. Measurement uncertainties vary from :. ±1 0 dB at 200 MHz decreasing to ±4 dB j from approximately 1.0 GHz to 18 GHz.

Directional characteristics of an antenna or I

test equipment placed inside a mode-stirred

chamber are lost, resulting in the need to

j estimate their free-space maximal gain as a | function of frequency in order to correlate \ results obtained by open-field tests. However, tests can be performed cost effectively '

in a shielded environment, with sufficient \ accuracy to make these facilities very attrac.l

tive for diagnostic testing and for minimiz-

ing the need for expensive testing in

| facilities such as anechoic chambers.

AVAILABILITY Two mode-stirred chambers are available:

^ one that is 2.74 m x 3.05 m x 4.57 m and - smaller version, l.l6mx 1.425 mx 1.47 n:,. NIST staff are available for collaborative - programs or to advise and interpret meas-

urement results. Independent testing also

; can be arranged. '.

Contact: Motohisa Kanda

(303) 497-5320

email: mkanda@micf.nist.gov

Division 813-07

Boulder, Colo. 80303-3328

GROUND SCREEN ANTENNA

RANGE

The ground screen antenna range is an

open area test site.

CAPABILITIES The ground screen consists of 6.35-mm

mesh galvanized hardware cloth stretched over a level concrete slab. The screen is

30.5 m wide x 6l m long and is spring loaded around the perimeter to ensure uni- form tension, a flat surface, and adequate

compensation for thermal expansion. The

overall size of the ground screen permits farfield measurements in the high-frequency

portion of the spectrum, and the mesh

dimension provides for an efficient ground

plane well into the ultrahigh frequency

region.

APPLICATIONS The range can be used for the following:

• antenna calibrations;

• antenna patterns at any polarization;

• electromagnetic susceptibility measurements;

• electromagnetic radiated emission measurements;

• calibration of field intensity meters; and

• wave propagation studies in frequency or time domains.
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY 37

RANSVERSE

LECTROMAGNETIC

iELLS

!iST researchers have designed and conructed several transverse electromagnetic

^T:M) cells that are available for use. A iM cell is a device for performing radiated ectromagnetic emission and susceptibility fiasurements of electronic equipment. Its

sign is based on the concept of an

,panded transmission line operated in a £M mode. The cell is a two-conductor sysTi with the region between the inner and

Iter conductors used as the test zone. The

pered sections at both ends are required

i' match the cell to standard 50 Q coaxialble connectors.

J'ABILITIES

'le cell provides a shielded environment for

''-.ting without introducing multiple reflec- ts experienced with the conventional

aelded enclosure. It simulates very closely

I'olanar far field in free space and has conint amplitude and linear phase charac-

'•istics. The external electromagnetic

yials will not affect the measurement of

'tv-level radiated emission from the device

- .der test. The high-level test field genered inside a cell for radiated susceptibility

Its will not interfere with external elec- mic systems.

VUCATIONS

' addition to radiated electromagnetic

mpatibility/interference testing, other

plications of the TEM cells include the

ilibration of antennas and the study of bio-

'^ical effects of radio-frequency radiation.

LIMITATIONS The usable frequency range is limited by an

upper bound determined by the appearance

of the lowest high-order mode. The volume

available for testing purposes is inversely

proportional to this upper frequency limit, The size of the device to be placed inside a TEM cell for testing should be small relative

to the available test volume in order that the field structure associated with the ideal TEM mode existing in an empty cell not be

significantly perturbed.

AVAILABILITY

Several TEM cells with five different sizes and five upper frequency limits in the 100 MHz to 1 GHz range are available. In

collaborative programs, NIST staff are avail- able to advise and interpret measurement

results. Independent testing also can be

arranged.

Contact: Motohisa Kanda

(303) 497-5320

email: mkanda@micf.nist.gov

Division 813.07

Boulder, Colo. 80303-3328

ELECTROMAGNETIC

ANECHOIC CHAMBER

The electromagnetic (EM) anechoic chamber at NIST is a facility for generating standard, well-characterized electromagnetic

fields. Such fields are fundamental to the

research, development, and evaluation of antennas, field probes, and EM material

properties.

CAPABILITIES EM fields up to 100 V/m can be established

in the chamber over the broad frequency range from 200 MHz to 40 GHz, and up to 200 V/m for certain frequency bands above

1 GHz. A majority of the individual systems composing the measurement system are under computer control, thus enhancing

statistical control of the measurements. The

chamber dimensions are 8.5 m x 6.7 m x

4.9 m.

APPLICATIONS The EM chamber is used in areas such as:

• research, development, and evaluation of new EM-field-generation and measurement

methods;

• antenna and field-probe development

and evaluation;

• calibration of field measurement

instruments;

• susceptibility testing of electronic equipment;

• shielding effectiveness and material parameter studies; and

• special tests for government agencies,

industry, and universities.

AVAILABILITY

This facility is used heavily in performing

calibrations for industry and other govern- ment agencies. It is available for inde- pendent or collaborative work with NIST.

Contact: Motohisa Kanda

(303) 497-5320

email: mkanda@micf.nist.gov

Division 813.07

Boulder, Colo. 80303-3328
MANUFACTURING

ENGINEERING LABORATORY

COOPERATIVE RESEARCH

OPPORTUNITIES

iiriil

NIST engineers and scientists are devel- oping many of the tools for automated

intelligent-processing systems that will soon be the core of all world-class manufacturing operations. These components

include intelligent machines; advanced

sensors for real-time in-process measurements; software for precision control of machine tools; and information technol- ogy for integrating all elements of a

product's life cycle, from planning and

design through marketing and customer

support.

The Manufacturing Engineering

Laboratory provides technical support

for industry groups that develop standards for measurements, measurement

techniques, hardware, software, and data

interfaces. It operates the Automated

Manufacturing Research Facility, a unique national resource for studying a wide range of manufacturing topics. Laboratory researchers also work at the

forefront of the emerging field of nanofabrication, developing measurement

tools for the atomic-scale production

technologies of the future.

Laboratory staff members work closely with their industry counterparts, from

the planning of research projects to the dissemination of results.

Contact: Richard H.F. Jackson, Acting Director (301) 975-3400

email: jackson@nist.gov

fax: (301) 948-5668 B322 Metrology Building

COOPERATIVE RESEARCH

OPPORTUNITIES

Precision Engineering

38 Atomic-Scale Measuring Machine

39 Advanced Optical Systems 39 Measuring Patterned Layers on integrated Circuits 39 Measuring Surface Roughness

Automated Production Technology

39 Quality in Automation Program 40 Machine-Tool Performance

Evaluation and Accuracy Enhancement 40 Precision Piston Turning

Robot Systems

41 Intelligent Machine Controls

41 Sensory Processing and World

Modeling for Intelligent Control

41 Off-Line Programming of Robotic Systems

41 Robot Metrology 42 Mobile Robotic Systems 42 Robotic Deburring of Machined

Parts 42 Robotic Crane Technology

Factory Automation Systems

43 Product Data Exchange Standards

for the Apparel Industry 43 Inspection and Tolerances Research 43 National PDESTestbed

44 Rapid Response Manufacturing

Intramural Project 44 Design Research Laboratory 44 Computer-Aided Manufacturing

System Engineering

RESEARCH FACILITIES

45 Automated Manufacturing Research

Facility 45 Acoustic Anechoic Chamber

PRECISION ENGINEERING

Division Contact: Dennis A. Swyt

(301) 975-3463

email: swyt@micf.nist.gov

fax: (301) 869-0822 A109 Metrology Building

ATOMIC-SCALE

MEASURING MACHINE

By the year 2001, uncertainty requirements

for dimensional metrology of step heights, surface roughness, linewidth, and line spac- ing for the integrated circuit and optics industries will be 0.1 nm to 1 nm. Further- more, these uncertainties need to be held

over areas ranging from several square

millimeters to fractions of a square meter. To address these needs, NIST is building the

2 2 molecular measuring machine (M ). M

will be capable of positioning and measuring to atomic-scale accuracies over an area

of 25 cm". It incorporates a scanning tun- neling microscope into a unique system

design that includes a very stiff core structure, carriages for moving the probe over

'

the sample, interferometry for measuring

probe and sample position, and two stages

'

of isolation from seismic and acoustic per-

turbations. Construction and testing are under way.

After construction is completed, M will

serve as an independent means for characterizing distances, geometries, and distortions of highly ordered arrangements of

2 atoms on single-crystal surfaces. M also

will serve as an exploratory tool for buildin mechanical and electrical structures in the nanometer-size range. Among the organizj

tions collaborating on the construction of

are several major universities and
MANUFACTURING ENGINEERING LABORATORY

Btional laboratories as well as Watson

lesearch Center, AT&T Bell Laboratories, nd Zygo Corp.

ontact:

[. Clayton Teague

301)975-3490

117 Metrologv' Building

ADVANCED

IPTICAL SYSTEMS

jvanced optical systems increasingly are

esigned around high-accuracy, aspheric

-ptical elements. Measuring the figure error

generalized aspheres to the required accufcy is a complex and unsolved problem.

llST is embarking on a program to charac- 'mze the systematic errors of commercial,

base-measuring interferometers used for

-arface figure metrolog)' and to develop

i .chniques to use these instruments for

j spheric metrology. The goal of the pro- ram is to close the gap between the resoluI jon and the accuracy of phase-measuring

uterferometers. NIST researchers are workf'pg with personnel at Wyko Corp. and Zygo

orp., which manufacture these inter- frometry systems.

j IIST researchers already have demonstrated

I Isignificant sensitivity' to fringe density of

le measured figure error for several comlercial phase-measuring interferometer sys-

; *ms. They are working to build a dedicated

^ 1 ;tst facility for future systematic investiga-

.ijons. The results of this work will make it

ossible to manufacture lightweight, highjWormance optical systems for space-based

Dplications and multilayer mirror systems

or projection X-ray lithography.

..ijmtact:

\ Tyler Estler

i501) 975-3482

nail: estler@enh.nist.gov

' .Metrology Building

MEASURING PAHERNED

LAYERS ON INTEGRATED

CIRCUITS

NIST researchers are developing techniques

for measuring the critical dimensions of patterned layers on integrated circuits. The

work involves theoretical projects on the formation of images in the optical and

scanning electron microscopes as well as experimental and design projects on the construction of new metrology instruments

for the calibration of standards. The project was initiated about 15 years ago at the request of the semiconductor industry.

The ever smaller dimensions on integrated

circuits have created a demand for new and

improved techniques of measurement and

their related standards, especially as feature

sizes approach and become smaller than the wavelength of light used in conventional

optical metrology instruments. The dimensions of present interest range from about

0.5 |im to 30 |im and will extend to smaller dimensions in the future. A series of three linewidth/pitch Standard Reference Materials for photomasks is presently in production. Research is in progress to develop new

and improved standards for use in instru- ments utilizing optical or scanning electron microscopy.

Contact: Robert D. Larrabee

(301) 975-2298

email: larrabee@sed.eeel.nist.gov A347 Technology Building

MEASURING

SURFACE ROUGHNESS

The need for effective, on-line control of

surface texture is increasing. For example,

many U.S. automobile companies are beginning to see superior coatings as a potential

competitive advantage over foreign competition. One of the keys to achieving this advantage is better on-line surface measure- ment methods. NIST is using contacting

and optical profiling techniques as well as

optical scattering to develop such methods

(which will be sensitive to the functionality

of the components). The researchers already have used an experimental lightscattering instrument and a long-range

scanning tunneling microscope to generate

accurate descriptions of light scattering from rough metal parts and from glossy paper. They currently are studying the

effects of using a light-scattering system to

inspect glossy paper during manufacturing.

The researchers plan to adapt this system

for other materials and manufacturing processes. They also intend to build a remotely

controlled profiling instrument. These

advances will provide a better understanding of the relationship between process parameters and surface finish. NIST

researchers currently are working closely with academia, the automotive and painting industries, and standards committees.

Contact: Theodore Vorburger

(301) 975-3493

email: tvtv@enh.nist.gov A117 Metrology Building

AUTOMATED PRODUCTION

TECHNOLOGY

Division Contact: Donald S. Blomquist

(301) 975-6600

email: blomquis@micf.nist.gov

fax: (301) 869-3536 BIO6 Sound Building

QUALITY IN

AUTOMATION PROGRAM

This program is an effort to achieve higher

part accuracy from existing discrete-parts

manufacturing equipment. A four-layer,

closed-loop, control architecture has been

proposed. Three layers are being imple- mented: real-time (RT), process-
MANUFACTURING ENGINEERING LABORATORY

intermittent (PI), and post-process (PP)

control loops. The RT and PI loops imple- ment algorithms to predict and/or measure

machine- and process-related systematic

errors and compensate for them via real- time tool path modification and NC pro- gram modification. The PP loop is used to

verify the cutting process and to tune the other two control loops by detecting residual systematic errors measured on the finished

parts, correlating these errors to the uncompensated machine- and process-related

errors, and modifying the control parameters of the other loops accordingly.

Feature-based error-analysis techniques

are being developed to identify the residual systematic errors of the system. NIST

researchers are working with industry and academia to use DMIS-defined features in

their analyses. They are developing tools for

feature segmentation of part geometries to improve analyses of the manufacturing

process. They also are developing a quality database using feature types and the errors measured on these features as key fields.

Contact: M. Alkan Donmez

(301) 975-6618 B106 Sound Building

MACHINE-TOOL

PERFORMANCE

EVALUATION AND

ACCURACY ENHANCEMENT

Deterministic manufacturing is a concept based on the premise that most errors in manufacturing are repeatable, thus predictable. Errors that are predictable can be measured and corrected, thereby improving

quality through better control of the exist- ing manufacturing equipment. Machine

tools are computer-controlled, multi-degree- of-freedom structures that have inherent

quasistatic and thermally induced geometric errors. Complete characterization of

these errors is being investigated to evaluate and enhance performance under changing

thermal conditions. This process is complicated and time consuming.

NIST researchers are working with industry

and academia to optimize this process to make it feasible for even small manufacturers. NIST, industry, and academia worked

together to develop the industry standard for machining center performance evaluation (ASME B5.54). Compensation of machinetool errors is an area of continuing interest. Researchers are developing generic electronic hardware to implement error compensation without any intrusion into the

existing machine-tool controllers. They also

are working to speed up the on-machine

part inspection by introducing fast probing

and powerful data analysis capability at the machine-tool level.

Contact: M. Alkan Donmez

(301) 975-6618 B106 Sound Building

PRECISION

PISTON TURNING

The Precision Piston Turning Project is a

cooperative research effort between NIST, General Motors Corp., Ford Motor Co., and

Giddings and Lewis, with funding through

the National Center for Manufacturing

Sciences. The primary objective is the transfer of NIST's expertise in machine tool enhancement and technology to U.S. industry. This goal currently is being achieved by

researching and applying enhancement

methods for a Giddings and Lewis Piston Turning Machine, model 3000.

This project is comprised of several activities. The first task was performed in 1992, when a research team from NIST traveled to Giddings and Lewis' Fraser, Mich., plant to analyze the design of a prototype of the 3000. Using infrared technology and contact temperature sensing devices, an investi- gation of the thermal behavior of the

machine tool was performed. Based on |

analysis of the data collected during this investigation, several design changes were recommended. These changes were implemented on the machine tool, which was

sent to NIST for a more rigorous thermal

analysis.

NIST is now performing a full geometric- thermal characterization of the machine,

using laser interferometry and other advanced sensors. The characterization is performed by monitoring the error motions

existing in the machine tool as it is brought

to a variety of thermal states. The thermal

states are quantified by the use of remote

temperature sensing devices attached at var ous locations on the components and structure of the machine. The end result of this characterization is a geometric-thermal

error map of the piston turning machine.

This error map can then serve as the data- base for real-time error compensation.

Benchtop analysis of two key machine com

ponents is also under way. These components are the linear actuators, which

control cutting tool position, and the spin-l

dies, which rotate the parts. In general, thei pistons machined on this tool are elliptical

in shape. The designs of the linear actuate: and spindles are being analyzed, and their performance is being tested to identify further areas in which machine accuracy can

be enhanced.

This project is expected to have several ben*

fits for the U.S. automotive industry. The

performance of this particular machine tO(

will be improved, yielding both higher pro

ductivity and better piston quality. Of

additional benefit to industry will be the knowledge gained by the industrial partne

in the project in the areas of thermal bal- ance and thermal gradient control within

the machine tool, error characterization, and error compensation.

Contact:

Kari Harper

(301) 975-6612 B106 Sound Building
MANUFACTURING ENGINEERING LABORATORY

ROBOT SYSTEMS

Division Contact:

Braes S. Alb us

;:30l) 975-3418

;-mail: albus@cme.nist.gov

lax: (301) 990-9688 p24 Metrolog\' Building

INTELLIGENT MACHINE

CONTROLS

'tlie concept of advanced real-time, sensorv'-

jiased control of machines has been a goal

:*i researchers and system developers for

^pver a decade. However, the lack of a strucured, theoretical approach for designing

'jid developing such systems has limited

«verely the number and sophistication of

; applications seen in operation today. Based

,<n years of research and development in

eal-time, sensorv' control of robots and

I'nanufacturing systems, NIST is conducting

I ihe research necessary to develop a standj .rdized architecture for implementing intel-

|-jigent machine control. This architecture nas been adopted by such organizations as

4jie National Aeronautics and Space Adminifttration, the U.S. Army, and a number of

jiforporations.

'.JIST's current research seeks to expand and

'.ocument a formal mathematical theory for he control of intelligent machines and to

Verify these theories using testbeds involving

I i'Oth simulation and actual controller hardjWare. Advanced control concepts, involving

planning, sensory processing, world model-

' ng, and knowledge representation, are

•eing investigated. Several independent

jj|ievelopment projects are under way to dem-

••nstrate implementations of these control

f'rinciples on functioning machines. They

^volve automated manufacturing, robotic

'^burring, space robotics, construction,

remotely operated land vehicles, under- ground mining, and undersea vehicles.

Contact: James S. Albus

(301) 975-3418

email: albus@cme.nist.gov B124 Metrology Building

SENSORY PROCESSING

AND WORLD MODELING

FOR INTELLIGENT CONTROL

Intelligent control of machines requires a

detailed knowledge of both the machine

and its operating environment. Since these

are both dynamic in nature, it is necessary

to measure, analyze, and comprehend

changes in real time to achieve intelligent, sensory-based control of machines. NIST

has a number of projects focused on developing advanced sensory-processing and world modeling capabilities. Sensory-processing

research includes work on specialized vision systems, real-time image processing, and

sensor data fusion. Vision systems being

investigated include non-uniform resolution, active scanning of the fovea over

points of interest, and active control of multiple cameras.

Under investigation are image-processing

techniques for obtaining dense range maps

from image flow and from stereo images. World modeling research is concentrating on data structures that can represent both

spatial and symbolic information about surfaces, objects, and regions of space. Methods

are being developed for comparing world model and sensory data so that one could,

for example, generate a map overlay that is

registered with and tracks camera images in

real time. Also being developed are Kalman

filtering techniques for updating the world model based upon sensory data.

Contact:

Ernest W. Kent

(301) 975-3418

email: kent@cme.nist.gov

B124 Metrology Building

OFF-LINE PROGRAMMING

OF ROBOTIC SYSTEMS

Off-line programming (OLP) systems are used to generate robot programs without

the use of the actual robot. OLP has two advantages over the traditional teachingdependent programming method: It improves safety, and system downtime is reduced because the robot is not involved in developing and debugging programs. Unfortunately, most commercially available OLP

systems rarely produce the final robot control programs.

Research at NIST has focused on the use of OLP to generate directly robot control pro- grams to determine robot trajectories for part handling and deburring. Since the models of the robot and the workstation lay- out never exactly match the actual equip- ment, there can be significant errors between the OLP-generated robot positions and the actual points through which the robot will move. To compensate for this, NIST has developed several sensor-based approaches for automatically calibrating or

registering the OLP model of the robot and

workstation with the real systems. This per- mits automatic generation of reliable robot programs in a matter of seconds or minutes

instead of the hours or days required for manual teaching.

Contact: Ronald Lumia

(301) 975-3452

email: lumia@cme.nist.gov B127 Metrology Building

ROBOT METROLOGY

Characterizing the performance of a robotic system is important in understanding the

limitations of the system and in optimizing

its operation. Although several U.S. and

international standards committees are working on measuring robot performance, no standard robot acceptance and characterization tests currently exist. Research is
42 MANUFACTURING ENGINEERING LABORATORY

ongoing at NIST to develop and validate standard test procedures for measuring

robot performance. NIST has been working

closely with the Robot Industries Association subcommittee on developing such tests.

Currently, a laser-tracking interferometer

system, originally designed and developed

by NIST and now available commercially, is used to make these measurements. This sys- tem provides very accurate position measurements of 1 to 2 parts in 100,000 and an

angular accuracy of 1 to 2 seconds of arc. Also under development is a low-cost robot

calibration system that consists of a series of

string encoders mounted to a fixture. This system provides a relatively inexpensive

robot calibration system with an accuracy

of ±0.127 cm. Currently, research is being conducted to characterize the performance

of this system and to expand its capabilities from measurement of three degrees-of- freedom to a.full six degrees-of-freedom.

Contact: Kenneth R. Goodwin

(301) 975-3421

email: kgoodwin@enh.nist.gov B124 Metrology Building

MOBILE ROBOTIC SYSTEMS

NIST has been conducting a joint research program with the U.S. Army on the develop- ment of a mobile robotics platform for military applications, and with the Department

of Transportation (DOT) Intelligent Vehicle Highway Systems (IVHS) program on the development of a vision-based vehicle mobility control system for autonomous

driving.

As part of the Department of Defense's (DOD's) Robotics Testbed Program, NIST is involved in specifying the basic control system architecture for the mobile vehicles

that are to be used in tactical applications. This control system handles autonomous

subsystem integration and communication

with the remote operator station. The goal

of the program is to have a standard architecture that could be adopted by the military

for all of its robotics applications, thereby

significantly reducing integration costs and

allowing subcomponents to be transferred between different robotics systems.

NIST's support of the DOT IVHS program

includes applying technology developed under the DOD program to the needs of the

private sector. The goal of the IVHS program

is to increase highway safety and traffic

flow, while reducing driver workload.

NIST has developed and demonstrated a

vision-based approach for autonomous road

following under the Advanced Vehicle Control Systems element of the IVHS program.

Demonstrations of autonomous driving have been conducted on a test course at NIST; on a local Maryland highway; and on

a closed-loop test track at the Montgomery

County, Md., Police Training Academy. The

current system uses the painted stripes on

the road to steer the vehicle along the center

of a lane. The vision processing cycles at

15 Hz and can drive the vehicle at 55 mph

in bright sunlight, on cloudy days, in the

rain, and at night. Future work will include

the development of more robust and reliable approaches for extreme variations in out- door conditions. Other research includes development of vision processing and control approaches for autonomous car following. This technology is of interest to both

the Army and DOT. Convoying or platooning of vehicles is envisioned for future auto- mated transportation systems.

Contact: Maris Juberts (301) 975-3422

email: juberts@cme.nist.gov B127 Metrology Building

ROBOTIC DEBURRING OF

MACHINED PARTS

Engineers at NIST are developing an auto- mated system that produces precision chamfers on aircraft engine components

fabricated from titanium and inconel. The

chamfers, or beveled edges, must be placed on parts such as turbine engine blades and

hubs to relieve potential areas of stress con-'' centration and ease assembly. The system,

called the advanced deburring and chamfei,

ing system (ADACS), consists of a six-axis '

electric robot fitted with an actuated chamfering tool. This tool is capable of highspeed force control within a small work area.

The approach is to use the industrial robot

as a coarse positioning device, while relyin; on the actuators and force sensors of the

tool to provide control of cutting force and

stiffness at the part edges. The tool compen

sates for robot inaccuracies and other factors, such as part misalignment and large

tolerances. The system has maintained

chamfers of 38 |im on titanium while trav ersing corners, in spite of part positioning

errors on the order of several millimeters. The ADACS builds on two techniques pio- neered in the NIST Automated Manufactur

ing Research Facility: a technique to generate robot trajectories off-line from CA

data, and a technique to integrate a variet'

of sensors into the robot-control system.

Contact: Maris Juberts (301) 975-3422

email: juberts@cme.nist.gov B127 Metrology Building

ROBOTIC CRANE

TECHNOLOGY

Shipbuilding, aircraft manufacturing, an( building construction operations rely on

cranes with a single cable for lifting heav

loads. The problem with this approach is

that the load is free to rotate and swing w

the slightest side force. NIST has designed
MANUFACTURING ENGINEERING LABORATORY

prane that provides a very stiff load platform

'diat can be used to lift heavy loads or as a

t)ase for mounting a conventional indusi irial robot. The design consists of a trianguI liar platform suspended from six wire cables,

i 6y adjusting the length of each cable from

i ^independently controlled winches, it is possi- ble to position the platform accurately. As

[ilong as the cables remain in tension, this

I configuration provides a significant

I jimprovement in stiffness and positioning

; capability over conventional cranes. NIST is

:';Duilding several testbed systems to investi-

] jgate the performance of this crane design.

j fontact: Kenneth R. Goodwin

,.,(301) 975-3421

email: kgoodwin@enh.nist.gov

'jB124 Metrology Building

FACTORY AUTOMATION

SYSTEMS

Division Contact: Howard M. Bloom

!'i{301) 975-3508

j email: bloom@cme.nist.gov

' fax: (301) 258-9749

' Mil Metrology Building

PRODUCT DATA EXCHANGE

STANDARDS FOR THE

APPAREL INDUSTRY

jjlNumerous vendors supply computer-aided

'apparel design and pattern-making equipment. Each vendor's equipment represents

the design and pattern data in a unique or

"proprietary file structure, preventing the

direct electronic exchange of data among

different organizations. NIST is helping the

jjiapparel industry to develop standards for

''product data exchange. NIST researchers have developed a prototype computer pro-

^fgrara for translating apparel pattern data

between different file storage formats. The

' 'program demonstrates the feasibility of

^^'oising a single, standard, interchange format. The program implements an information model also developed at NIST.

The software was developed as part of an ongoing project at NIST to extend the emerging international Standard for the Exchange of Product Model Data to apparel

applications. The work is partially sponsored by the Defense Logistics Agency and is being carried out in cooperation with the Computer Integrated Manufacturing Committee of the American Apparel Manufacturing Association. In the short term, the goal

is to develop a neutral data format for exchanging two-dimensional pattern data between apparel CAD systems. In the longer

term, researchers plan to develop an infor- mation model that can be used to encompass the entire apparel life cycle.

Contact: Theodore Hopp

(301) 975-3545

email: hopp@cme.nist.gov A127 Metrology Building

INSPECTION AND

TOLERANCES RESEARCH

To establish a unified framework of U.S. and international standards dealing with mechanical tolerance issues, NIST scientists

are carrying out a program of research and

technology development in inspection and

tolerances. These activities are aimed at developing a common technical basis for

tolerance standards. The efforts involve development of emerging standards on

dimensional measurement methods, particularly regarding coordinate measuring

machine (CMM) methods.

The standards of interest include standards

for tolerance models, inspection performance, mathematics of tolerances, and statistical tolerance methods. Examples of

critical emerging and draft standards are

the Standard for the Exchange of Product Model Data, the Mathematical Definitions

of Dimensions and Tolerances, and Perform- ance Testing of Coordinate Measuring

Machine Software. The work also involves participation on standards committees,

research on measurement methods, and

interaction with other government agencies

to assess and improve the performance of CMMs used in their laboratories and production facilities.

Contact: Theodore Hopp

(301) 975-3545

email: hopp@cme.nist.gov A127 Metrology Building

NATIONAL PDES TESTBED

Product data is an integral part of the infor- mation shared across computer applications and organizations, i.e., it is a crucial part of any integration scheme. Currently, no commercial products exist that allow systems to share information in a standard way and, consequently, to be integrated. STEP (the Standard for the Exchange of Product Model Data), when implemented, will simplify this integration problem. NIST is devel- oping the National PDES Testbed to provide

technical leadership and a testing-based foundation for the rapid and complete devel- opment of STEP. (PDES stands for "Product Data Exchange using STEP.") Major objectives of the testbed project include: the identification of computer software applications

that will use STEP, the specification of technical requirements for these applications,

the evaluation of the proposed STEP stand- ard with respect to application requirements,

the design and implementation of prototype STEP applications, the establishment of configuration management for STEP specifications and certain supporting software, and

improved interactions between organizations working to develop STEP.

Contact:

S. Jeane Ford

(301) 975-3747

email: ford@cme.nist.gov A127 Metrology Building
MANUFACTURING ENGINEERING LABORATORY

RAPID RESPONSE

MANUFACTURING

INTRAMURAL PROJECT

The NISI Rapid Response Manufacturing

(RRM) Project is sponsored as an intra- mural project through the NIST Advanced

Technology Program office. The project is managed and executed through the Factory Automation Systems Division. The principal

objective of the project is to establish col- laborations with National Center for Manufacturing Sciences (NCMS) RRM

consortium members and to leverage NIST

skills and technologies to ensure the ad- vancement of RRM capabilities. The project builds expertise and increases awareness of engineering and manufacturing technologies being applied to improve the process of rapid response manufacturing. The RRM

consortium intends to enhance and adopt

key technologies, including variant design,

rapid prototyping, design visualization, and generative NC to enable use of advanced, highly integrated systems for manufacturing.

The three primary focus areas of the RRM

Intramural Project include research and

development, RRM testbed laboratory, and

technology transfer. R&D efforts will increase the knowledge and

skills of NCMS RRM consortium members

and NIST personnel through assessments of

the current state of the practice and state of

the art in key technologies. The R&D pro- gram supports and accelerates development

of the engineering and manufacturing tech- nologies required by the NCMS RRM consortium. The NIST RRM testbed laboratory will be established as a neutral facility where NCMS RRM and NIST collaborators can

investigate interoperability between systems, experiment with the use of standards, and

perform exploratory system integration studies. The NIST RRM testbed will emulate the system architecture proposed for the NCMS

RRM integrated-engineering environment.

This laboratory will allow collaborators to

identify issues with technology and standards applied to RRM applications and to address information technology barriers to RRM. Technology transfer activities are an

important part of NIST's mission and will

also play a significant role in this project. Several project activities are included in

this focus area, including cooperative research and development, industry workshops, NCMS RRM committee participation,

and consultation with other NIST research

projects.

Contact: Mark E. Luce

(301) 975-2802

email: luce@cme.nist.gov A127 Metrology Building

DESIGN RESEARCH

LABORATORY

As automated design becomes more and more prevalent, researchers are, of necessity, becoming more interested in the "process" of design. Furthermore, the emphasis on concurrent engineering is making this an iterative and integrated process, rather than a one-shot, stand-alone process. Several research questions remain. Can soft- ware tools be developed to create and

maintain candidate designs in digital form? Can data structures for representing and

updating the knowledge contained in these designs be developed? Can formats for exchanging that knowledge across manufacturing functions be devised? To address

these and other interesting questions, NIST

is building an engineering design laboratory equipped with state-of-the-art computers and software.

NIST researchers are investigating the issues involved in integrating a variety of commercial and university "design" tools. They also have begun a project aimed at capturing

and representing "design knowledge and

intent" in a manner compatible with the emerging Standard for the Exchange of Product Model Data. The work currently is focused on rigid mechanical parts, including assemblies. NIST researchers are working with several major universities through

the Defense Department's Advanced

Research Projects Agency.

Contact: \ Mark E. Luce

(301) 975-2802

email: luce@cme.nist.gov A127 Metrology Building

COMPUTER-AIDED

MANUFACTURING

SYSTEM ENGINEERING

Just as computer-aided design and engineering tools have revolutionized product desigri during the past decade, computer-based

tools for production system engineering can^

revolutionize manufacturing. A new type of computer-aided engineering environment is envisioned, which will improve the productivity of manufacturing/industrial engineers. This environment would be used by

engineers to design and implement future manufacturing systems and subsystems.

The overall goal of computer-aided manufacturing system engineering is to lower manufacturing costs, reduce delivery times, and improve product quality through the coordinated development and use of advanced tools. The project is aimed at advancing the development of software envi, ronments and tools for the design and engi^

neering of manufacturing systems. NIST

researchers are placing an emphasis on pro- viding an integrated framework, operating

environment, common databases, and inter^

face standards for a wide variety of emerging tools and techniques for designing,

modeling, simulating, and evaluating the performance of manufacturing processes, equipment, and enterprises.

Contact: Chuck McLean

(301) 975-3511

email: mclean@cme.nist.gov A127 Metrology Building
MANUFACTURING ENGINEERING LABORATORY 45

RESEARCH

FACILITIES

lAUTOMATED

l/IANUFACTURING

RESEARCH FACILITY

The Automated Manufacturing Research

>acilit\' (AMRF) was established by NIST in

.982. The facilit)' has been co-sponsored

tince 1983 by the Navy and serves as one of

.«veral Centers of Excellence supported by

ihe Navy's Manufacturing Technolog)' Pro- »ram. NIST and other government agencies

'ftlso co-fund research within the AMRF.

;irhe objective of the AMRF is to develop automated manufacturing technologies

hat can improve the competitiveness of

ooth the commercial and defense industrial

aases. A key element of the AMRF is a

research testbed, completed in 1986, producing technical results that are being transJerred to the Nav\' and industry. Specific weas of research and development at the VMRF include advanced manufacturing

lystems, qualit)- and inspection, integrated

:ngineering tools, intelligent controls,

vensor-based automation, and precision

oaachining. These AMRF program activities aave resulted in many technical accomplish-

^nents, collaborations, patents, standards,

lajor awards, and, ultimately, commercial

I products.

^j||rhe workstations of the AiMRF are being

r ised in active research programs by NIST

: searchers, industrial research associates,

I ^est researchers, university' personnel, and

' cientists and engineers from other governi^nt agencies.

APABILITIES

jrhe facility currently supports research in

jOfiachine tool technology, robot systems,

tnetrology, motion control, sensors and senlory processing, accuracy enhancement,

real-time control, computer-aided engineering tools, production scheduling and control, factory networks, process planning,

and inspection technology. The facility is particularly suited for studying interfaces between production equipment and

information systems.

AVAILABILITY

This facilit)' has substantial potential for use by researchers from industry', academia,

and other government agencies to pursue

joint programs with NIST research personnel. Most successful work to date has

involved close working relationships between NIST and a collaborator for periods of 6 months or more.

Contact: John Meyer

(301) 975-6100

email: meyer@micf.nist.gov

142 Shops Building

ACOUSTIC ANECHOIC

CHAMBER

This facility is used to perform acoustical measurements under free-field conditions, usually at moderate to very small sound

pressures. These measurements include cali- brating the free-field amplitude and phase

responses of sound transducers, such as microphones and loudspeakers, and deter- mining acoustic intensity in well-defined sound fields.

The facility is a vibration-isolated shell- within-shell structure. All interior surfaces

of the inner shell are covered with a soundabsorptive treatment consisting of customdesigned, triple-density wedge modules. The

chamber dimensions, measured wedge tip

to wedge tip, are 6.7 m x 10 m x 6.7 m,

defining a volume of 450 m^ A wire-mesh

floor permits access to instrumentation

within the chamber.

Accessories include signal, control, and

power lines as well as instrumentation

supports on all six interior surfaces. Airconditioning ducts are acoustically treated and vibration isolated. Temperature and

humidit)' within the chamber are inde- pendently controlled by the heating, ventilating, and air-conditioning (HVAC) system.

CAPABILITIES The chamber provides a highly anechoic sound field and a very small mechanical

ambient noise level. The wedge modules are designed to absorb 99 percent or more of the normally incident sound energy at frequencies above 45 Hz. If increased acoustical isolation from the HVAC system and a uniform

temperature within the chamber are required simultaneously, the air flow to the chamber interior can be turned off while

controlled air flow continues between the inner and outer shells.

APPLICATIONS The chamber is used to calibrate and to characterize acoustical instruments and

their directionality under free-field conditions at moderate to very small sound pressures, to measure non-linear distortions, and to determine self-noise equivalent freefield sound pressures. The chamber is used

for basic research aimed at developing methods for calibrating microphones of standard and non-standard geometries, for calibrat- ing sound intensity probes and other transducer arrays and instruments, and for determining acoustic intensity.

AVAILABILITY

This facility has substantial potential for

use by researchers in industry, universities, and other government agencies. Scheduling

arrangements can be made for collaborative programs and individual research.

Contact:

Victor Nedzelnitsky

(301) 975-6638 Edwin D. Burnett

(301) 975-6636

David J. Evans

(301) 975-6637

A149 Sound Building
TECHNOLOGY LABORATORY

The Chemical Science and Technology

Laboratory develops the calibration and measurement standards for a wide range

of instruments and processes important

to the chemical-manufacturing, energy,

health-care, biotechnology, foodprocessing, and materials-processing

industries.

It produces Standard Reference Materials and Standard Reference Data needed to achieve ever lower detection limits and to improve the quality, productivity, and effi- ciency of chemical measurements. The

laboratory also is working with industry

to increase efficiency, cut costs, and

improve competitiveness through develop- ment of new sensor technologies, quantitative compositional mapping methods,

analytical techniques, and novel processes. An important focus is the develop- ment of environmental technologies to monitor the environment and to mini- mize waste produced by manufacturing

processes.

The laboratory maintains the national system of chemical measurement and

coordinates the system with those of other

nations.

Contact: Hratch G. Semerjian, Director (301) 975-3145

email: hratch@micf.nist.gov

fax: (301) 975-3845 A3 17 Chemistry Building

COOPERATIVE RESEARCH

OPPORTUNITIES

Biotechnology

47 Protein Characterization by TwoDimensional Electrophoresis 47 DNA Chemistry 47 Nuclear Magnetic Resonance

48 Bioprocess Engineering Measurements

48 Biomolecular Electronics 48 Biosensor Technology

49 Center for Advanced Research in Biotechnology

Chemical Kinetics and Thermodynamics

49 Chemical Thermodynamics

49 Chemical Kinetics

Inorganic Analytical Research

50 Atomic Spectroscopy 50 Analytical Mass Spectrometry 50 Electroanalytical Research 50 Activation Analysis

Organic Analytical Research

50 Capillary Electrophoresis

51 Bioanalytical Sensors

51 Supercritical Fluid Extraction

51 Laboratory Automation and Robotics

for Organic Analysis 52 Supercritical Fluid Chromatography

52 Fundamental Chemical and Physical Processes in Chromatography

52 Trace Organic Analysis Using

High-Resolution Chromatography

52 Methods and Standards for Drugsof-Abuse Testing 53 Mass Spectrometry of Biomolecules 53 Trace Gas Measurement Techniques 53 Instability of Compressed Gas

Mixtures

Process Measurements

5454

54

5555

56

Refrigeration Flow Measurement Research and

Standards High-Temperature Reactors Chemical Sensor Research Chemistry of Supercritical Water

Oxidation Processes

Chemistry of High-Temperature, Gas-Phase Materials Synthesis 56 Dynamic Pressure and Temperature

Research 56 Chemical-Vapor Deposition Reaction

Kinetics and Flow Modeling

56 Particulate and Droplet Diagnostics

in Spray Flames 57 Temperature Sensor Research

Surface and Microanalysis Science

57 Microbeam Compositional Mapping

57 Atmospheric and Chemometric

Research 58 Magnetic Engineering

Thermophysics

58 Properties of Fluids and Fluid Mixtures 59 Thermophysical and Supercritical Properties of Mixtures 59 Membranes Separation Technology 59 Modeling of Transport Phenomena

with Moving Boundaries 60 Properties of Atmospherically

Safe Refrigerants 60 Pressure Standards 60 Vacuum and Leak Standards

RESEARCH FACILITIES

61 Water Flow Measurement Facility

61 Fluid Metering Research Facility

61 Nitrogen Flow Measurement Facility 62 Neutron Depth-Profiling Facility
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

COOPERATIVE RESEARCH

OPPORTUNITIES

SIOTECHNOLOGY

Oiiision Contact:

\MTi]. Powell

;.301) 975-2627

;mail: powell@niicf.mst.gov

^x: (301) 330-3447

i345 Chemistrv" Building

!>ROTEIN

CHARACTERIZATION BY

TWO-DIMENSIONAL

I ELECTROPHORESIS

I ST researchers are using a twoi limensional electrophoresis system to char-

' icterize proteins and peptides. They are robing the influence of size, shape, and

harge on migration characteristics in the

icctrophoretic medium. Although well-

'efined protein "markers," especially of molecular weight, are required to d!ow standardization of polyacrv'lamide gel

icctrophoretic systems, charged pol^Tueric

naterials other than proteins may be considred for markers. Because staining and

ic'.ection of such markers is of special interst. the researchers plan to examine the i^chanisms of silver stains using neutron

icivation techniques.

he researchers will use image processing

state-of-the-art instrumentation to

jrra meaningful databases. As part of

n:s program, NIST plans to issue wellharacterized mixtures of proteins as Standrd Reference Materials that will be used

to assess the abilities of existing and new

electrophoretic techniques to separate and

detect proteins.

Contact: Dennis J. Reeder

(301) 975-3128

email: djreeder@micf.nist.gov

A353 Chemistr}' Building

DNA CHEMISTRY

Working in several areas of DNA chemistry, NIST scientists are actively manipulating

DNA to produce proteins, developing methods for measuring DNA damage at the molecular level, and developing methods

for characterizing DNA, including profiling.

NIST scientists are developing experimental

methods to measure DNA damage in mammalian cells exposed to free-radical- generating systems, such as ionizing

radiation, elevated ox}'gen pressure, redox- qxling drugs, and a number of carcino- genic compounds. Free radicals produced

in-vivo are thought to be mutagenic and

carcinogenic. Measurement of DNA damage

at the molecular level in mammalian cells

is a prerequisite to understanding the chemical mechanisms of damage by free radicals. Techniques used for measuring DNA damage include gas chromatography, mass spectrometr)', HPLC, and NMR spectroscopy.

NIST scientists are working on new methods

for DNA profiling, ranging from developing

well-characterized DNA fragment standards

for restriction fragment length polymorphisms to performing research for rapid determination of DNA profiles by poly- merase chain reaction amplification and

automated detection of fragments. In addition, cooperative development of short-term

repeat technology and attendant standards

is sought. Techniques for DNA detection in- clude sensitive staining of electrophoretic

gels, use of chemiluminescence, and en- hanced methods for capillary electrophoresis.

Contact: Dennis J. Reeder

(301) 975-3128

email: djreeder@micf.nistgov

M. Miral Dizdaroglu

(301) 975-2581

A3 53 Chemistry Building

NUCLEAR MAGNETIC

RESONANCE

Programs are under way in which NIST

scientists are using nuclear magnetic reso- nance (NMR) spectroscopy to study simple

peptides and proteins, aminoglycoside and

macrocyclic antibiotics, carbohydrates,

glycoproteins, and DNA. The studies are

facilitated by research materials isotopically labeled with carbon-13 or nitrogen-15,

which are prepared by synthetic or biosynthetic methods.

The researchers are making extensive use of two-dimensional NMR methods, including

homonuclear and heteronuclear chemical

shift correlation and J-resolved techniques, nuclear Overhauser measurements in the rotating frame, and indirect detection. Meas- urements of chemical shifts and coupling

constants provide information on the structures, stereochemistry, and conformations

of biomolecules. Determination of nuclear Overhauser effects and relaxation times

allows the imposition of distance constraints for three-dimensional structure

analysis and characterization of molecular

dynamics, respectively.
48 CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

In the future, researchers plan to use three- and four-dimensional NMR techniques to

investigate higher molecular weight bio- molecules. Detailed knowledge of the three- dimensional structures and conformations

of the biomolecules is important to an

increased understanding of biochemical

reaction mechanisms, enzyme specificity, drug-protein/DNA binding, and molecularrecognition processes.

Contact: Bruce Coxon

(301) 975-3135

email: coxon@enh.nist.gov A353 Chemistry Building

BIOPROCESS ENGINEERING

MEASUREMENTS

NISI scientists are actively involved in the development of theories, measurement

methods, models, and databases for upstream and downstream bioprocessing.

To accurately measure cell parameters and

product amounts during fermentation for bioreactors—upstream processing

researchers are making precision thermo- dynamic measurements and developing

sensor technologies. Downstream processing

research includes the development of funda- mental transport data and experimental

methods and models for separation of proteins and other biomolecules from complex

mixtures. Among the methods under study

are aqueous two-phase partitioning systems, chromatography, and electrophoresis

technologies.

In the area of biothermodynamics, NIST

researchers have developed accurate and precise microcalorimeters to measure the heat

released in enzyme-catalyzed biochemical

reactions of interest to biotechnology. When

coupled with equilibrium measurements,

these measurements enable the reliable modeling of the thermodynamics of these

processes. These data are used to predict reli- ably the efficiency of biochemical processes

outside the normal measurement ranges for temperature, pH, and ionic strength.

Light-scattering studies are being made on

biomacromolecular solutions to characterize their transport and thermodynamic

properties. Models and experimental methods, needed to obtain the necessary data, are being developed to characterize aqueous

two-phase separation techniques. NIST

scientists are using small-angle neutron

scattering to characterize chromatographic

media in concentrated polymer solutions.

Contact: LuraJ. Powell

(301) 975-2627

email: powell@micf.nist.gov A345 Chemistry Building

BIOMGLECULAR

ELECTRONICS

Biological molecules have many properties that may allow them to act as substitutes for present-day electronic components. Studies

are under way in laboratories around the world to develop molecular wires, gates, information storage devices, and even simple computers.

NIST scientists are studying the light sensitive protein bacteriorhodopsin (BR) as a

potential repository of information. These

studies require methods for immobilization

of BR and characterization of its physical

and chemical properties. In addition, NIST

scientists are attempting to control the rate

at which this molecule moves from one transition state to the next. In this manner it

is believed that optical methods may be developed for the storage and retrieval of information using BR in the form of an

"optical disk."

Contact: Howard H. Weetall (301) 975-2628

email: weetall@micf.nist.gov A353 Chemistry Building

BIOSENSGR TECHNOLOGY^

Biosensors use a biocomponent for the '

rapid, sensitive, and specific determination \ of an organic or biological compound.

These devices, which can be utilized for

j on-line measurements in real time, have ^

potential for widespread use in biomedical,

\ clinical, environmental, and industrial

'

monitoring.

Basic problems associated with biosensor

technologies must be overcome, however, to ,. ensure successful commercialization. NIST „ scientists are examining the mechanisms of- protein immobilization and stabilization o

surfaces. Optical fiber techniques are being ^ developed for making non-intrusive, rapid

and selective measurements. Fluorescence , techniques, as well as Raman and reso- nance Raman spectroscopy, are used to determine the characteristics of amino

acids, small peptides, and small organic molecules as an aid to eventually providing

improved sensor specificity and selectivity. , Molecular diffusion, rotational mobility, . complexation, and photochemical inter- action also are being examined.

NIST scientists are developing ampli- '

fication technologies, including liposomeencapsulated molecules, multiturnover

| enzyme reactions, and ion-exchange

polymer-modified electrodes. Such methods' and devices provide the potential for extremely sensitive devices.

Contact: Howard H. Weetall

(301) 975-2628

email: weetall@micf.nist.gov A353 Chemistry Building
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY 49

VENTER FOR ADVANCED

tESEARCH IN

llOTECHNGLGGY

i. the Center for Advanced Research in

jtotechnolog}' (GARB) in Rochille, Md., nndy established by NIST, the Universit)' of

[aryland, and Montgomery County, Md., rel archers study protein structure/function

tlationships. They are focusing on the leasurement of protein structure by X-ray

;j|Ty5tallography and nuclear magnetic reso- ance spectroscopy as well as the manipulamof strucnire by molecular biological

chniques, including site-directed

utagenesis. Protein modeling, molecular

'namics. and computational chemistr)' are ^d to understand protein structure and to

predict the effects of specific structural

f.odifications on the properties of proteins nd enzymes. A variety of physical chemisy methods are used to measure and ana28 structural changes, activities, and

|iemiod\-namic behavior of proteins under

Vvestigation. C\RB maintains state-of-the-

"t facilities for protein crystallography,

MR spectroscopy, molecular biolog>', and

oysical biochemistry. Its computer facili- include a variet)' of computational

ad high-resolution graphics workstations

;well as access to the NIST Cyber 205

;;«percomputer.

ontact:

obertoj. Poljak

ifliail: poljak@irislO.carb.nist.gov

^ryL. Gilliland

nail: gar\'@ibm3. carb.nist.gov

501) 738-6277

^00 Gudelsky Dr.

ockville, Md. 20850

CHEMICAL KINETICS AND

THERMODYNAMICS

Division Contact: Sharon G. Lias (301) 975-2562

email; sgl@micf.nist.gov

fax: (301) 926-4513 A260 Chemistry Building

CHEMICAL

THERMODYNAMICS

NIST researchers use precision oxygen- bomb and fluorine-bomb calorimeters to determine data on enthalpies of combustion, from which enthalpies of formation can be derived. The addition of a new low- temperature heat capacit)' calorimetry facilit}' now gives the NIST thermodynamics

laboratories the capacit)' to carr}' out the

full range of measurements necessar}' to predict chemical equilibrium constants for S)3tems of interest. The focus is on the deter- mination of thermodynamic properties of materials of importance to modem tech- nologies and of unique compounds that can

be obtained only in small quantities, as well

as on the certification of Standard Refer- ence Materials. The Chemical Thermodynamics Data Center carries out expert evaluations of thermodynamic data on

organic and inorganic compounds. Current

interests include comprehensive evaluations

of the thermodynamic data for species involved in the reactions related to the destruction of ozone in the upper atmosphere, and of data for organic compounds.

The latter work has the long-range goal of producing reliable estimation schemes for predicting the properties of species for which measurements are not available.

Contact: Sharon G. Lias (301) 975-2562

email: sgl@micf.nist.gov

A260 Chemistry Building

CHEMICAL KINETICS

The chemical kinetics program at NIST

provides reliable chemical kinetics data, measurement methods, and theoretical models. Applications of this research include combustion, new chemical technologies,

the chemistry of the upper atmosphere and

other planetary atmospheres, effects of ioniz- ing radiation on materials, solar energy conversion, flue-gas cleanup chemistry, acid

rain, toxic waste incineration, coal conversion, and analytical applications of kinetics. Among the experimental projects under way

at NIST are pulse radiolysis of aqueous solutions and kinetic mass spectrometric studies of the kinetics and thermochemistry of ion/molecule reactions and ion/molecule

clustering processes.

Researchers also are studying free-radical

kinetics using heated single-pulse shock

tubes, flash photolysis kinetic absorption

spectroscopy and a flash photolysis reso- nance fluorescence technique, vacuum

ultraviolet laser photolysis with kinetic absorption detection, and high-temperature

reactors. Resonance-enhanced multiphoton

ionization (REMPI) spectroscopy is used to provide new, previously unobtainable data about the electronic structures of a wide

variety of free radicals. REMPI procedures

also lead to very sensitive and selective schemes for the optical detection of the

radicals.

An important focus of the kinetics program

is the production of databases of evaluated chemical data (including kinetic data and

spectral data for analytical chemistry) as well as the design of databases and relevant

software.

Contact: Sharon G. Lias (301) 975-2562

email: sgl@micf.nist.gov A260 Chemistry Building
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

INORGANIC ANALYTICAL

RESEARCH

Division Contact: James R. DeVoe

(301) 975-4144

email: dev@micf.nist.gov

fax: (301) 926-6182 B206 Chemistry Building

ATOMIC SPECTROSCOPY

Atomic spectroscopy methods are probably

the most widely used analytical techniques

in industry today. Considerable research is required to keep up with the changing needs

of industry. At NIST, research in atomic

spectrometry is focused on several different

areas. For instance, researchers are working

to improve the analytical capabilities of the inductively coupled plasma as an atomic

excitation source. Additional research concerns the use of uv-vis Fourier transform

spectroscopy for optical line assignments of atomic transitions in commonly available atom sources. X-ray fluorescence is used for homogeneity testing and certification of a wide variety of metals, ceramics, and other

materials.

NIST scientists also are developing a series of neutral density filters that can be issued

as Standard Reference Materials for verify- ing the accuracy of the transmittance and

absorbance scales of ultraviolet, visible, and

near infrared absorption spectrophotometers.

Contact: Robert L. Watters (301) 975-4122

email: watters@micf.nist.gov B222 Chemistry Building

ANALYTICAL MASS

SPECTROMETRY

Analytical mass spectrometry has played a

key role in industries, such as the semiconductor industry, that require accurate measurements of trace elements in raw materials, products, and product containers. The NIST

inorganic mass spectrometry program is de- veloping analytical capabilities for making

highly accurate determinations of trace inorganics using stable isotope dilution.

Areas of research include developing instru- mentation in thermal ionization, inductively coupled plasma ionization, and

photoionization mass spectrometry, as well

as devising methods for highly accurate measurement of absolute isotopic abundances. Methods are also developed for generating and characterizing pure

reagents and for performing ultratrace chemical analyses.

Contact: John D. Fassett (301) 975-4109

email: jdfass@micf.nist.gov A21 Physics Building

ELECTROANALYTICAL

RESEARCH

Electroanalytical research is vital to the development of methods and materials for environmental and clinical determinations. A broad range of electroanalytical and

chromatographic techniques, such as voltammetry, coulometry, and ion chromatography, are used by researchers at NIST

for analysis and research. Research on

standardization of pH and electrolytic con- ductance leads to the certification of new

classes of Standard Reference Materials.

Contact: William F. Koch

(301) 975-4141

email: koch@micf.nist.gov B206 Chemistry Building

ACTIVATION ANALYSIS

Nuclear methods of analysis provide unique

approaches to quantitative analysis. In this research, methods of nuclear analysis are investigated utilizing the 20-megawatt NIST

research reactor. All areas of the technique

are researched, including the use of cold neutrons, the use of monitor activation, radiochemical separations, the use of focused neutrons, the development of prompt gamma-activation techniques, and

neutron-depth profiling.

Contact: Robert R. Greenberg

(301) 975-6285

email: greenber@micf.nist.gov B125 Reactor Building

ORGANIC ANALYTICAL

RESEARCH

Division Contact:

Willie E. May

(301) 975-3108

email: wem@micf.nist.gov

fax: (301) 926-8671 B158 Chemistry Building

CAPILLARY

ELECTROPHORESIS

The exciting new technique of electrophore-"

sis in small-diameter capillaries provides a

tremendous opportunity for basic research

into the fundamental properties and inter- actions of ions and neutral molecules. The

association of analyte ions via simple electrostatic attraction, or more stable complexation, may be studied directly by the

effect on the electrophoretic mobility of thel

ions. Hydrophobic interactions between neui

tral molecules and charged micellar surfac-i

tants can be investigated using micellar

electrokinetic capillary electrophoresis

(MECE).
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

"lirough the use of electrohte modifiers,

itch as urea and methanol. MECE can be

:Ctended to very non-polar molecules. SurIctants with more specific interactive charcter, such as aromaticit}' and chiralit}",

' -mi further exploration. Other "physical"

. (ditives also promise to increase the appli-

'ibihtv" of capillar)' electrophoresis (CE).

olubie polymeric gels can be used to pro- de molecular weight discrimination for

iomolecules, where differences in charge

tay be too small to allow direct CE

paration.

election in CE is also a hot research area,

ne small sample size and capillar)' dimenons make sensitive detection difficult. Elec- pchemical detection in CE by the use of

icroelectrodes does not suffer from the mensional habilities normally associated

th the use of small capillaries. Using

lowledge gained from the recent explora-

«n of oxidative detection via carbon fiber

id platinum electrodes, researchers also ould be able to carry- out reductive detecpT\ at mercurv' film electrodes. Sensitive

itical CE detection using axial absorfnce, as well as laser-source thermal lens

i-d fluorescence modes, is of current interat NIST.

mtact:

'lliamA. MacCrehan

01) 975-3122

(lail: wam@micf.nist.gov

, ;58 Chemistry Building

lOANALYTICAL SENSORS

sensors are a new generation of anahti-

,. ;1 devices with the potential for widespread

. , 2 in biomedical and industrial monitor-

-. ig applications. Biosensors will incorporate

;

(i latest advances in biotechnology to prole high specificity and sensitivity. Biologi1; derived substances have great value as nponents of sensing devices because of

:ir binding specificit}', the strength of

eir interactions, and their potential for

use in conjunction with a wide variet}' of amplification schemes. Immunological,

enz\matic, and receptor-ligand interactions

are being explored as the basis for anahlical measurement.

NIST researchers are using a variet\" of optical techniques for detection. Detection can

be based on changes in size and rotational

mobilit}' of anahtes or binding agents upon

interaction, or it can be the result of enzy- matic activit)' that occurs due to anahle

binding, causing enhanced fluorescence

or absorbance signals. Amplification can

be achieved with release to liposomeencapsulated molecules or multiturnover

enz\TOe reactions. Combining high specificity for anahles with amplification provides

the potential for extremely sensitive devices.

Contact: Laurie Locascio-Brown

(301) 975-3130

email: lbro\\Ti@micf.nist.gov

B156 Chemistr)' Building

SUPERCRITICAL FLUID

EXTRACTION

NIST researchers are studying the basic mechanisms responsible for analyte release

in supercritical fluid extraction (SEE) processes. They are designing experiments to determine the role of pressure, temperature, and extractant fluid composition on the equilibrium and kinetic processes of analyte

release from both simple model and complex environmental matrices.

Research in this area also encompasses the

practical application of anahlical SFE to a wide variet}' of sample matrices; the modeling of the analyte-trapping process and concurrent design/optimization of trapping media; hardware and software development

for automated extraction systems for on-line chromatographic analysis; investigations of intermediate anahte class separations based on solid-phase adsorbents, following the extraction; and the design of

expert systems for the optimization of SFE

system performance. Anahte/matrix combinations being studied include polycyclic aro- matic hydrocarbons and polychlorinated

biphenyls in such matrices as sediments,

soils, and air particulate matter; fat-soluble vitamins in foods and serum; and drugs of abuse in body fluids and hair.

Contact: Stephen N. Chesler

(301) 975-3102

William A. iMacCrehan

(301) 975-3122

email: wam@micf.mst.gov

B158 Chemistry Building

LABORATORY AUTOMATION

AND ROBOTICS FOR

ORGANIC ANALYSIS

NIST has joined with industry' and other government agencies in a cooperative project to develop automated anahlical devices

for organic analysis based on new chemistries and apparatus, as well as on laboratory

robotic systems. One project focuses on the development of an on-line system for extraction of solid samples (using supercritical

fluids and volatile liquids) with deposition onto a short chromatographic column, fol- lowed by selective elution for conventional chromatographic analysis. Also, researchers

are studying the use of a state-of-the-art laboratory robotic system for automated

sample preparation of samples for clinical and environmental analysis.

Contact: Stephen N. Chesler

(301) 975-3102

William A. MacCrehan

(301) 975-3122

email: wam@micf.nist.gov

B158 Chemistry

Gary W. Kramer

(301) 975-4132

email: gkramer@enh.nist.gov A213 Chemistry' Building
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

SUPERCRITICAL FLUID

CHROMATOGRAPHY

Supercritical fluid chromatography (SFC)

in both capillary and packed columns has been shown to offer several advantages

when compared with liquid and gas chromatography for high-efficiency separations of non-volatile, reactive, or thermally labile molecules. NIST scientists are investigating the variables that influence retention, selectivity, recovery, and efficiency of SFC separations; the use of SFC as an analytical

technique for providing high-efficiency

separations and accurate quantitative analysis of complex mixtures; and the use of

supercritical fluids for extraction of solid and liquid samples emphasizing on-line

extraction and analysis of microsamples.

Contact: Stephen A. Wise

(301) 975-3112

email: sawise@micf.nist.gov Lane C. Sander

(301) 975-3117

B158 Chemistry Building

FUNDAMENTAL CHEMICAL

AND PHYSICAL PROCESSES

IN CHROMATOGRAPHY

Solute retention in chromatographic sys- tems is the result of a complex assortment

of molecular interactions between the solute, the stationary phase, and the mobile

phase. The diversity of these interactions can be used to optimize separations for different classes of compounds by varying separation parameters, such as stationary phase

and/or mobile phase composition, and col- umn temperature. An understanding of

these fundamental retention mechanisms

facilitates the optimization of separations in gas chromatography (GC), liquid chromatography (LC), and supercritical fluid chro- matography (SFC).

Recent LC research has focused on the de- sign of chemically bonded stationary phases

(such as monomeric and polymeric Cis phases and charge transfer phases), which

offer unique capabilities for the separation

of isomeric compounds and compound

classes. Polycyclic aromatic hydrocarbons have been used as model solutes for investi- gating retention mechanisms. Since these compounds are highly isomeric, retention

effects resulting from differences in solute shape can be isolated by studying isomer sets.

Molecular modeling of solutes and station- ary phase species holds the potential to provide further insight into retention mechanisms. Similar approaches can be taken to characterize retention processes in GC and SFC. A comparison of the retention behavior for isomer sets in GC, LC, and SFC may prove useful in developing a unified understanding of chromatographic retention processes.

Contact: Stephen A. Wise

(301) 975-3112

email: sawise@micf.nist.gov Lane C. Sander

(301) 975-3117

Michele M. Schantz

(301) 975-3106

B158 Chemistry Building

TRACE ORGANIC

ANALYSIS USING

HIGH-RESOLUTION

CHROMATOGRAPHY

NIST research in high-resolution chromatography is focused on the development of gas chromatography (GC) and liquid chro- matography (LC) methods for the determi- nation of individual organic compounds in complex mixtures. Research areas in GC

include:

• development of systematic chromatographic approaches for sample preparation/

cleanup and analyte preconcentration priori;

to GC analysis;

• development of multidimensional chro- matographic procedures using stationary

phases of differing selectivity;

• use of simultaneous multiple and/or

selective detection systems (such as mass

spectrometric, electron capture, and atomic

emission detectors); and

• development of on-line extraction and

analysis of solid microsamples.

Recent activities have emphasized the mea?

urement of trace levels of environmentally \ significant compounds, including poly- chlorinated biphenyls and polycyclic aro- matic hydrocarbons, in natural matrices such as sediment, tissue, and airborne

particulate matter.

Using LC, researchers will focus on the following approaches to analyzing complex mixtures: solid-phase extraction on

short columns as an isolation/cleanup/

preconcentration step; development of multidimensional LC procedures to isolate and quantify selected compounds; selectiw detection systems (such as uv, fluoresceno

electrochemical, mass spectrometric, chen

cal derivatization); and the development c microcolumn LC procedures.

Contact: Stephen A. Wise

(301) 975-3112

email: sawise@micf.nist.gov Michele M. Schantz

(301) 975-3106

B158 Chemistry Building

METHODS AND STANDARD

FOR DRUGS-OF-ABUSE

TESTING

To reduce the use of illegal drugs, particu

| larly in work-related activities, many em-j

ployers are now performing drug tests on
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

iployees and prospective employees. Most

! : these tests involve analysis of urine sam-

> for traces of drugs or metabolites, cause tests used to screen urine samples

r drugs are subject to cross-reactivit\' from

fal substances, it is strongly recomended, and in many cases mandated, that

i positives from the screening procedure

j subjected to confirmator\' analysis by

:hromatography/mass spectrometrv'

L MS). The GC/MS methods are used not

|ly to confirm the presence of drugs but

(0 to determine quantitatively if concenitions of the drugs are above specified cutr levels. Laboratories performing these

"irraator^' anal)'ses must ensure that

:i: methods produce accurate results.

i support accuraq' in drug testing, NIST

jentists are developing a series of urine-

" Sed Standard Reference Materials with

propriate concentrations of drugs of

luse. Drug levels are certified by a com-

: pation of two independent methods, one

:.- which is generally GC/MS. Research is

.: ^oing to develop alternate methods to

: tnplement GC/MS.

hsiderable attention is now focused on an

^-nate matrix for drug testing. Human

' provides a long-term record of drug

;n contrast to urine, which provides a

rd of only the previous 48 hours to

tiours. NIST scientists are investigating

jHlytical aspects of hair analysis for drugs

^abuse. Research areas include the extracin of drugs from hair, measurement methf, the effects of hair treatments on drug

iels, and differentiation between hair

'teraally contaminated with drugs and

ir with drug levels acquired through emal use.

!act: :;.aelJ.Welch

Jlj 975-3100

i[ lUil: rajwelch@raicf.nist.gov

58 Cheraistry Building

MASS SPECTROMETRY

OF BIOMOLECULES

Major advances in mass spectrometry have improved its capabilities for characterizing biomolecules. Techniques such as fast-atom bombardment, electrospray, matrix-assisted

laser desorption, and others permit the accurate determination of molecular weights of peptides and small proteins previously

unmeasurable by mass spectrometry. Molecular weights greater than 100k dal- tons are now being determined with accuracies far exceeding those of other techniques. Advances in structural determinations of biomolecules include the use of collision- induced dissociation and photodissociation

for determining sequence information for peptides and oligonucleotides. Considerable

attention now is focused on coupling these new mass spectrometric techniques with developments in capillar}' electrophoresis

and microscale liquid chroraatography.

Scientists at NIST are investigating these new techniques to understand their capabilities and apply them to biomolecule characterization. They are particularly interested

in applying these techniques to the quantitative analysis of species not previously amenable to mass spectrometric analysis. These

capabilities should result in the develop- ment of reference materials to support

industries involved in biotechnology and

biomedical research.

Contact: Michael J. Welch

(301) 975-3100

email: mjwelch@micf.nist.gov

B158 Cheraistry Building

TRACE GAS MEASUREMENT

TECHNIQUES

Accurate measurement of gaseous species is

of great importance to many industries for applications ranging from quantification of pollutant and toxic gas emissions to the

quality control of products. The validity of

data derived from such measurements is

tied directly to the availability of useful gas measurement techniques and to the degree

of understanding of their capabilities and

limitations. Although a variety of tech- niques have been applied to trace gas analysis, more research is needed to improve the present state of the art. This research is particularly important because of the growing need for the analysis of specific gas species

in multicomponent gaseous mixtures; it

also is necessary to extend accurate analyses

to below the parts-per-million and parts-perbillion levels.

Current NIST research focuses on new detection systems using chemiluminescence, elec- trochemistry, infrared diode laser systems,

capillary gas-liquid and gas-solid chromatography coupled to mass spectrometry, and

isotope-dilution mass spectrometiy. Institute scientists also are examining the use of

class-specific detectors for gas chromatography and evaluating electronic circuitry to optimize signals and reduce instrumentation noise and drift.

Contact: Franklin R. Guenther

(301) 975-3939

email: guenther@micf.nist.gov

B158 Chemistry Building

INSTABILITY OF

COMPRESSED GAS

MIXTURES

Inorganic and organic compressed gas mixtures are employed extensively throughout

industry to calibrate equipment used to

assess the quality of products and the effectiveness of emission controls. Although the

stability of these mixtures is critical to their

successful use, a number of instances have

been noted in which instability has been

observed, particulariy in mixtures contain- ing low levels of reactive gaseous species, such as nitrogen oxides, sulfur dioxide, and

hydrocarbons.
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

The reasons for instability may differ somewliat for various gaseous species, but they

are related to at least two possible phenomena: gas-phase reactions and gas-metal

interactions with the internal surface of the

cylinder, NIST researchers are working to improve the understanding and predictability of these phenomena. Their tech- niques involve those employed in surface

science studies and other approaches, such

as Fourier-transform infrared, diode laser, and other spectroscopies; mass spectrometry; metal analysis; trace water and oxygen

analysis; chemiluminescence analysis; and

the use of specifically doped mixtures and

homogeneous gas phase kinetics.

Contact: Franklin R. Guenther

(301) 975-3939

email: guenther@micf.nist.gov

B158 Chemistry Building

PROCESS

MEASUREMENTS

Division Contact: Gregory]. Rosasco

(301) 975-2609

email: rosascog@micf.nist.gov

fax: (301) 926-5002 B312 Physics Building

REFRIGERATION

Cooling superconducting electronics, magnetic devices, and highly sensitive infrared

detectors require specialized refrigerators capable of reaching cryogenic temperatures. Other applications, such as satellite cooling

or gas liquefaction, demand long-term reliability and maintenance-free operation. Advances in the 1980s led to widespread

interest in many regenerative-cycle refrig- eration systems for these applications,

including the use of pulse-tube refrigerators. NIST is the world leader in pulse-tube

refrigeration research and is developing

extensive engineering databases for these

devices and other regenerator applications.

In pulse-tube studies, NIST scientists have

developed the orifice pulse-tube refrigerator

(OPTR), which has reached temperatures

of 60 K in a single stage. Using thermoacoustic drivers (TADs) in place of mechanical compressors, an OPTR was designed

with no moving parts. A patent, a Strategic Defense Initiative Office innovative technol- ogy award, and an R&D 100 award have

been received for this device, called a TADOPTR. Recently, the TADOPTR was pro- posed for liquefaction of natural gas at remote well sites, where about 30 percent of

the gas produced would be burned to run

the TAD, providing cooling to liquefy the remaining 70 percent.

Substantial research efforts have been

applied to the development of improved

regenerators for refrigeration systems. NIST

researchers have assembled the world's

largest database for adsorption of low- temperature gases on carbon. NIST computer models of regenerator performance

are the only optimization tools available to designers of regenerators.

Contact: Ray Radebaugh

(303) 497-3710

Division 836.06

Boulder, Colo. 80303-3328

FLOW MEASUREMENT

RESEARCH AND

STANDARDS

The accelerating costs of scarce fluid resources and valuable fluid products

particularly petrochemical fluids—are causing increased concerns about the per- formance of flowmeters. Improved flow measurement traceability needs to be established and maintained so that realistic.

quantified data are generated on a continu; ing basis to assure practical fluid measure- ments at satisfactory performance. To

achieve the desired flow measurement tract

ability, NIST is designing transfer standardto link the performance of calibration

facilities to appropriate national reference standards.

Because of the importance of these measurl

meats, transfer standards need to be

designed so that high levels of confidence can be placed in them and their performance. The new transfer standards will be rii orously evaluated against NIST fluid flow

calibrafion standards. As part of the evaluation, the appropriate range of calibration,

will be done on the developed standards so that performance can be assured at specifij

levels. Current fluid-metering research pre, grams use laser Doppler velocimetry (LDVji techniques to focus on the flows producec

by conventional pipeline elements and by standard flow conditioning elements. New experimental programs are feasible using LDV or other anemometry or flow- visualization techniques to study other

flows. NIST also has computational capab

ties to model numerically a number of closed conduit flow fields.

Contact: George E. Mattingly

(301) 975-5939

email: gem@micf.nist.gov

105 Fluid Mechanics Building

HIGH-TEMPERATURE

REACTORS

Chemical and associated industries prodi enormous amounts of byproducts. To avo* wasting industrial resources and pollutin

the environment, the impact of these byproducts must be minimized. The solu-?

tions are minimizing waste at the source; modifying industrial processes; recovering energy and chemicals for reuse; and con\

ing pollutants to acceptable species. For n of these solutions, thermal treatments

offer the most promising approach. Henc
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

ipre is urgent need for detailed mechanish elucidation of fundamental thermal

Dcesses, such as pyroh'sis and oxidation,

-kt govern chemical conversion and

- -Btruction of both model compounds and

)tual industrial b)'products.

(ST maintains two instrumented facilities

at are exceptionally promising for effifnt pyrohlic and oxidative destruction

ia wide variety of chemical compounds:

fluidized bed reactor and a plug-flow

actor designed for long residence times

-econds) at elevated temperatures. The

search centers on kinetic studies, both fbal and mechanistic, of destruction

-•Tnodel compounds representative of ^jor industrial byproducts, the most

ninent of which are chlorinated hydrojm and nitrogen-containing species

:nes and nitrocompounds, for examThe scientists are investigating: 1) the

;cts of temperature, residence time, and

paposition of reactor fluids on both the

Btruction efficiency' of the model com-

|und and formation and disappearance of

'•ermediate products; and 2) the effects of

:: ly corrosive reactor environments on

actural materials. Diagnostic instrumenlion includes both on-line sampling with

asequent analysis by several analytical

Ihniques (GC, MS, and FTIR) and in-situ deal systems.

fitact:

drej Macek

975-2610

^ail: macek@micf.nist.gov

Physics Building

HEMICAL SENSOR

ESEARCH

understand the performance of thin-film

. isors, NIST scientists are conducting

-'Rcarch aimed at improving the sensitivity,

:::pectivity, stability, and accuracy of their lonse, as well as developing concepts for sensing and measurement techniques.

Research investigations focus on mechanisms governing surface adsorption and

desorption processes, interfacial diffusion, adhesion mechanisms, and surface morphology as these relate to sensing in chemical, biochemical, and physical systems.

Analytical methods are used to relate the

structure and composition of sensing

devices to fabricating parameters and per- formance as well as to develop mechanistic performance models. Research areas include thin-film thermocouples and resis- tance devices, moisture and pH sensors, gas phase chemical sensing based on tin and

other metal oxides, and self- assembled monolayer-based structures. Fabrication

facilities available include magnetron sputter deposition of metals and metal oxides and gas reactors.

NIST scientists also are investigating the feasibility of thin-film systems as improved

chemical sensors. Their research efforts employ an array of surface spectroscopic

techniques to determine the electronic properties of thin-film and single-crystal speci- mens. Among the techniques used are X-ray

and uv photoemission and thermal desorption spectroscopies, SIMS, and in-situ electrical measurements. Recent research

activities have focused on the use of self- assembled organic monomolecular films as adhesion layers for future multilayer sens- ing structures for chemical and biochemical

materials.

Contact: James R. Whetstone

(301) 975-2738 •

email: jrwhet@micf.nist.gov Kenneth G. Kreider

(301) 975-2619

Stephen Semancik

(301) 975-2606

Michael J. Tariov

(301) 975-2058

A303 Physics Building

CHEMISTRY OF

SUPERCRITICAL WATER

OXIDATION PROCESSES

Supercritical water oxidation (SCWO) is a new technology with high promise as a safe,

efficient process for the minimization and

destruction of hazardous materials. It is a

totally contained process that takes place in water above its critical point, that is, at pres- sures greater than 22 MPa and temperatures above 374 °C. Under these conditions, many

reactions proceed unusually rapidly, producing benign end-products carried in the output water stream. Industrial implementation of SCWO has lagged, in part because of an inability to prescribe the process variables, such as the temperature, pressure, flow rates, and concentration of oxidants, required for safe, efficient waste destruction. These, in turn, demand understanding of fundamental thermodynamic and kinetic processes in supercritical media.

NIST researchers are seeking to supply both

the understanding and data necessary to support reliable process modeling for SCWO.

The experimental work centers around reactors for studies of chemical kinetics and

durability of materials, as well as a unique

flow reactor, which provides optical access

for in-situ measurements of density, chemical species, temperature, and product/

reactant concentrations. The researchers

currently are studying the ammonia destruction reactions as functions of temperature,

pressure, and added oxidant.

Contact:

Andrej Macek

(301) 975-2610

email: macek@micf,nist.gov

B312 Physics Building
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

CHEMISTRY OF

HIGH-TEMPERATURE,

GAS-PHASE MATERIALS

SYNTHESIS

The semiconductor, coatings, and ceramics

industries require high-performance thin

films, particles, and fibers. This demand for materials with micro-engineered mechanical, electrical, and optical properties has

placed greater emphasis on the development

of new processing methods and on the need

for increased fundamental understanding of materials-fabrication processes.

NIST researchers are seeking an understanding of high-temperature materials

synthesis in a fast-flow reactor that provides

reaction temperatures in excess of 1500 K

and residence times as short as 10 ms, allow- ing extension of conventional chemical

kinetics to temperature regimes representative of the chemistry in materials

processing. The reactor has provisions for molecular-beam sampling of gas-phase species, including clusters, with subsequent mass spectrometric analysis. It also is equipped with optical excitation and diagnostic probe beams.

Currently, NIST scientists are researching

the homogeneous (gas-phase) and hetero- geneous (thin-film and cluster/aerosol) chemistry of silicon oxide. They are comparing measurements of species and growth

kinetics to the predictions of chemical reaction and fluid flow models developed for

the process. This approach identifies rate,

purity, or defect-limiting steps in the

process.

Contact: Michael R. Zachariah

(301) 975-2063

email: mrz@tiber.nist.gov

B312 Physics Building

DYNAMIC PRESSURE AND

TEMPERATURE RESEARCH

U.S. industr}' increasingly relies on real- time monitoring of process parameters,

particularly temperature and pressure, to produce efficiently a desired end-product, to warrant safe operation, and to assure equity

in commerce. This trend is pervasive in the chemical and materials-processing industries, as well as in energy and raw materials production and transfer. NIST has a

research program and is developing a test

facility to provide a reliable basis for the evaluation and calibration of transducer dynamical response functions. The research

seeks to develop a primary standard for dynamic temperature and pressure based on

the fundamental properties of the molecular constituents of a dynamical system. Information about the molecules is accessed

via laser-optical diagnostic techniques, and measurement times of the order of 10 ns at accuracy levels of 5 percent appear feasible. Through the use of these measurement tech- niques, an accurately characterized dynamical source will be developed. This reference source and its associated measurement sys- tem will provide industry with a means for assuring the accuracy of transducers used to measure time-varying temperature and

pressure.

Contact: Wilbur S. Hurst

(301) 975-4814

email: whurst@micf.nist.gov

B312 Physics Building

CHEMICAL-VAPOR

DEPOSITION REACTION

KINETICS AND FLOW

MODELING

Chemical-vapor deposition (CVD) is an important process used to grow thin

films in the manufacture of microelectronics devices, as well as to produce highperformance coatings. CVD involves complex gas-phase chemistry, surface chemistry, and mass and heat transport processes. These highly coupled processes control the

quality, uniformity, and yield of the deposited layers. NIST researchers are developing;

and testing numerical models that can be

used to design and control CVD processing

reactors. These models account for gas- phase chemistry, particle formation, heat and mass transport, and surface depositionleading to the formation of thin films.

The modeling effort is coordinated with a measurement program to supply the required chemical kinetics and materials- growth information and to validate the raoj eling results in a materials-synthesis flow

reactor. The measurement program

includes optical and mass spectrometric

diagnostics of the gas phase and post- production evaluation of particle and film^ growth.

An interactive, graphics-based chemical

kinetics program has been developed. Researchers are constructing a supporting ( thermochemical and kinetics numerical

database, and they are developing two- dimensional heat and mass transport mod

els, which simulate reactor geometries

relevant to practical devices.

Contact: Donald R.F. Burgess

(301) 975-2614

email: don@batman.nist.gov

Ronald W. Davis

(301) 975-2739

email: rwdavis@nist.gov

B312 Physics Building

PARTICULATE AND

DROPLET DIAGNOSTICS

IN SPRAY FLAMES

To minimize the cost of high-priced fuel,

U.S. industry needs to obtain maximum . energy output from fuel combustion. NISI

researchers are tackling this problem by

attempting to improve combustion effi-
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

fclcy.

The researchers are studying the amies of spray flames to investigate

rcplet vaporization, pyrolysis, combustion,

"

i particulate formation processes and to c.meate the effect of chemical and physi-

(al properties of fuels on the above proc-

•sses. The research results will provide an

l^erimental database, with well-defined boundary conditions, for developing and

^dating spray combustion models.

\be experiments are being carried out a a spray combustion facilit}', with a

iioveable-vane swirl burner, which simu-

.:rs operating conditions found in practia combustion systems. A combination of

ua-intrusive probing techniques is used to

jbtain comprehensive data on spray com-

'tustion characteristics, including soot partile and droplet size, number densitv' and

i.ame fraction, gas composition, and

^locity and temperature fields.

lurrently, NIST scientists are focusing their

fforts on laser scattering and extinction rasurements to determine the effect of 4el chemistn', particularly in the case of pulticomponent fuels, on spray atomizawlon, combustion efficiency, and formation

f soot and gaseous pollutants.

iontact:

lary Presser 501) 975-2612

Tiail: cary@tiber.nist.gov 312 Physics Building

tEMPERATURE SENSOR

ttESEARCH

Tiproved industrial processes and sophisti-

-ted scientific research require temperaire sensors that cover wider temperature mges with better accurac)^ and precision

lan previously required. For example, the

^gradation of thermocouples exposed to gh temperatures for extended periods of

rne represents a serious impediment to mperature measurements in jet engines, maces, and so forth.

NIST has several projects under way to test and improve the performance of currently available sensors, including thermocouples,

and resistance thermometers of various

types. The temperature range covered by

these projects extends from about 0.2 K to 2100 °C. NIST has excellent temperature

calibration facilities, an automated laborator}' equipped to evaluate thermocouples at high temperatures, several laboratories equipped for work on resistance thermometers, and a laborator}' to evaluate industrial grade thermometers. NIST is planning a

series of new materials and techniques to provide highly precise and accurate temperature measurements.

Contact:

Billy W. Mangum

(301) 975-4808

email: bwm@micf.nist.gov

B128 Physics Building

SURFACE AND

MICROANALYSIS SCIENCE

Division Contact: Ranee A. Velapoldi

(301) 975-3917

email: velapol@micf.nist.gov

fax: (301)216-1134

B364 Chemistry Building

MICROBEAM

COMPOSITIONAL MAPPING

Interpreting the relationship between

the physical and chemical microstructure of materials is important in understanding

their macroscopic behavior and in extending their in-service performance. Conventional microbeam techniques for elemental/ molecular compositional analysis on the micrometer scale, such as the electron microprobe and ion microscope, have been

restricted to quantitative analysis at individ- ual locations. Mapping of the distribution of

constituents has been possible only at the

qualitative or semiquantitative level. However, recent NIST research developments have led to the production of the first truly quantitative elemental compositional maps.

Quantitative compositional mapping with

the electron microprobe has been demonstrated down to levels of 0. 1 weight percent, while quantitative isotope ratio measure- ment in images has been demonstrated with

the ion microscope.

Current research activities at NIST include extending compositional mapping to analytical electron microscopy, laser Raman

microanalysis, and laser microprobe mass

analysis. Potential projects could involve applying the compositional mapping instru- ments to materials characterization problems, developing new techniques for compositional mapping on other microanalysis

instruments, and investigating basic topics

in elemental and molecular quantitative

analysis with microbeam instrumentation.

Among the equipment available at NIST

are an electron microprobe, an analytical

scanning electron microscope, 200- and

300-kV analytical electron microscopes, an

ion microscope (secondary ion mass spec- trometry, SIMS), a time-of-flight SIMS, a

laser microprobe mass analyzer, a laser Raman microprobe of NIST design, and

extensive computer facilities, including

image processing.

Contact: Dale E. Newbury

(301) 975-3921

email: newbury@micf.nist.gov AII3 Chemistry Building

ATMOSPHERIC AND

CHEMOMETRIC RESEARCH

Current regional and global concerns with

the impact of human activities on the envi- ronment, including environmental contamination and wastes, atmospheric pollution,

and potential effects on health and climate make it imperative to determine with a high
58 CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

degree of accuracy the individual sources of noxious species. State-of-tlie art researcli, pioneered at NIST, makes possible unique

source identification by application of the most advanced microchemical and isotopic

analytical techniques, including accelerator mass spectrometry and high-precision gas

isotope ratio mass spectrometry.

Complementing advanced isotopic- chemical characterization of atmospheric

gases and particles is basic research in chemometrics, which represents the

synthesis of chemical knowledge and meas- urement with modern statistical and computational methods. Work in this area is

directed toward improving the quality of chemical measurements generally through advanced design, measurement and data

analysis quality assurance, and graphical

multivariate data exploration.

Contact:

Lloyd A. Currie (301) 975-3919

email: currie@enh.nist.gov

B364 Chemistry Building

MAGNETIC ENGINEERING

Magnetic thin films play a key role in many

information storage products, and improved

performance of these products depends in

large part on the ability to engineer

improved manufacturing processes for these

films. At present, a wide knowledge gap

exists between the magnetic thin films pro- duced with great precision and studied in

great depth by the basic research community and the magnetic thin films manufactured by industry in the development of new

commercial products.

NIST has designed and built a novel instru- ment which will bridge the gap between

these communities. The instrument provides for magnetic thin films to be produced

by industrial manufacturing methods and

investigated by the most advanced tech- niques of the basic research community.

The instrument is equipped for magnetic

thin-film deposition by the three basic methods: magnetron sputtering, electron beam

evaporation, and molecular beam epitaxy.

The composition and atomic microstructure

of the films is studied by X-ray photoelectron and Auger electron spectroscopy, ion scattering spectroscopy, reflection high- energy electron diffraction, low-energy elec- tron diffraction, sputter depth profiling, spectroscopic ellipsometry, and scanning

tunneling microscopy. The magnetic

properties of the films are studied in a super- conducting magnet by a magnet-optical

Kerr spectrometer and a 6-point contact magnetoresistance probe. A major advantage of this instrument is that all of these features are available in situ.

Contact: William F. Egelhoff

(301) 975-2542 B248 Chemistry Building

THERMOPHYSICS

Division Contact: Richard F. Kayser

(301) 975-2483

email: kayser@micf.nist.gov

fax: (301) 869-4020 A105 Physics Building

PROPERTIES OF FLUIDS

AND FLUID MIXTURES

The thermophysical properties of fluids and

fluid mixtures are essential for process design and control in the chemical, natural

gas, aerospace, environmental, and energyrelated industries. The properties of fluids research program involves experimental and theoretical research and computer

simulation studies on the thermodynamic

and transport properties of pure fluids and

fluid mixtures. A primary goal of this

program is to develop highly accurate predictive models for the thermophysical prop^

erties of fluids and fluid mixtures. This is accomplished through an integrated pro- gram of measurements, theory, and correkt

tion. Key ingredients of this program

include measurements of the thermo- dynamic and transport properties of pure

fluids and mixtures. Apparatus are availabl

for state-of-the-art measurements of pressure-volume-temperature relations, sound speeds, heat capacities, dielectric coi

stants, viscosities, phase equilibria, and the mal conductivities over wide ranges of operating conditions. Included in this worl

are measurements in the critical and

extended critical region. In concert with th experimental work, theoretical studies are

directed toward the development of wide- range predictive models and computer codi

A wide variety of research, both experimen

tal and theoretical, is directed toward the understanding of complex fluid behavior,

the microscopic structure of fluids, and tht

liquid-solid phase boundary. Included are

studies of non-Newtonian fluids, colloidal suspensions, shear-induced chemical reac

tions, supercooled fluids and melting phe- nomena, and macromolecules. A unique

shearing cell is available for neutron scatt ing studies at the NIST reactor.

Molecular-level computer simulation has proved an essential technique for utilizing

statistical mechanics-based models of condensed matter. Molecular dynamics sti

ies, involving both equilibrium and nonequilibrium systems, have been conducted Computer simulation studies are importai

in inteq)reting and understanding the

results of experimental studies in fluids ai

in developing predictive models of fluid

properties. Other theoretical studies inclucj dynamic and static critical region models

(emphasizing mixtures), extended corre- sponding states, equations of state, kinetii
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

ovf of gases and dense fluids, theon' of

•ij]^ glassy slate, properties of mixtures of disailar compounds, phase transitions, and

ucture-based modeling.

intact: Hiam M. Haynes

i)3) 497-3247

rail: haynes@micf.nist.gov

.ision 838.02

iQlder, Colo. 80303-3328

Ichael R. Moldover W 975-2459

lail: moldover@raicf.nist.gov

35 Physics Building

HERMOPHYSICAL

ND SUPERCRITICAL

ROPERTIES OF MIXTURES

emical process technology requires accue knowledge of various thermophysical

Uperties of pure, poh'functional chemicals

J their mixtures. NISI research focuses

the most important of these properties

jilibrium phase composition, density,

r pressure, and enthalpy. NIST

carchers are developing predictive meth-

' for the properties of chemically dis-

: ar compounds, especially complex

xiures and aqueous solutions. Another

I *ject is aimed at developing accurate pretive models for the thermodynamic and

I nsport properties of near critical and

' ')ercritical mixtures. This work includes

^ and VLE measurements on mixtures

itaining carbon dioxide, halogenated

irocarbons, and similar supercritical solts. Other experimental work involves ng supercritical chromatography to asure diffusion coefficients in supercritical mixtures and theoretical studies to focus on applying extended corresponding

states to supercritical systems.

Contact: Thomas J. Bruno

(303) 497-5158

email: bruno@raicf.nist.gov

Division 838.01

Boulder, Colo. 80303-3328

J.M.H.L. Sengers

(301) 975-2463

eraail: anneke@tiber.nist.gov A105 Physics Building

MEMBRANES SEPARATION

TECHNOLOGY

Merabranes are used increasingly in separation processes, novel synthesis processes, and as process sensors. To add to the science and engineering base of membrane technology, NIST scientists are working on methods

of measuring and correlating structure/ transport property relationships in phaseseparated polymers such as ionomers. This methodology should also be applicable to interpenetrating polymer networks and

polyraer blends. The raodel applications include acid gas and water separation of water and organics frora liquid and vapor

strearas (pervaporation processes). Recognizing the need to provide iraproved engineering raodels for design of integrated

processes, NIST staff are developing test protocols, facilities, and process design models.

Current models have been generated that improve the deterraination of raass transfer boundary layer effects in gas and liquid raerabrane contactors. The fouling of merabranes in pressure-driven liquid processes is a critical process difficulty. Researchers are studying the fundamental steps of irreversible protein adsorption as a model

system. Recent results have led to the devel- opment of an approach for surface modification, which is still under study but has

provided substantial improvements in early

testing.

Contact: John J. Pellegrino

(303) 497-3416

email; pellegrino@bldrdoc.gov

Thomas J. Bruno

(303) 497-5158

eraail: bruno@raicf.nist.gov

Division 838.01

Boulder, Colo. 80303-3328

MODELING OF TRANSPORT

PHENOMENA WITH

MOVING BOUNDARIES

As technology progresses, it is increasingly more difficult to create unifying theoretical descriptions of important processes and phe- nomena. Numerical software for simulating and analyzing fluid flow with associated heat- and mass-transfer is an increasingly

important tool for understanding the complex physical environraents that arise in engineering applications.

NIST has developed a highly flexible numerical library to model transport phe- nomena in a wide range of applications. This software has two key features: the

capability to address problems with moving

boundaries such as interfaces; and an

object-oriented design allowing it to be efficiently tailored for a very wide range of

applications. The software design optimizes

the ability to add quickly code modules

implementing new numerical algorithms to address our future needs. The net result is an evolving capability to address complex

problems in detail. Sample applications include simulating chemical vapor deposition for the design and characterization of a

coraraercial reactor and modeling the manufacture of supported membranes to understand the mechanisms and conditions

that lead to defects.
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

1

NIST researchers are currently building a

library of chemical reactions that can be

incorporated into the mass-transport

equations. Planned enhancements include

capabilities to model interfacial physics,

including phase changes.

Contact:

Adele P. Peskin

(303) 497-3466

email: adele@bldrdoc.gov

Gary R. Hardin

(303) 497-5168

email: hardin@bldrdoc.gov

Division 838.01

Boulder, Colo. 80303-3328

PROPERTIES OF

ATMOSPHERICALLY SAFE

REFRIGERANTS

Chlorofluorocarbons (CFCs) have been used

widely for the past 50 years as refrigerants;

as foam-blowing agents in building insulation, furniture, and car seats; and in many

other applications. Recent evidence has shown, however, that CFCs are breaking

down the stratospheric ozone layer that protects the Earth from harmful levels of ultraviolet radiation. Alternative chemicals must

be found to replace the existing fluids as quickly as possible.

To replace the CFCs, accurate knowledge of the thermophysical properties of the substitutes is required. NIST has a research pro- gram designed to provide these data to

industry, ultimately in the form of interactive computer codes. The research includes

extensive experimental measurements on

pure fluids and mixtures, including PVT,

PVTx, vapor pressure, saturation density, heat capacity, thermal conductivity, viscosity, sound speed, and surface tension. The

program also includes substantial effort in modeling fluid properties and in developing

equations of state.

Contact: Richard F. Kayser

(301) 975-2483

email: kayser@micf.nist.gov A105 Physics Building

PRESSURE STANDARDS

Achieving better understanding and control

of the pressure measurement process will lead to better quality control in the manufacture of new materials and better design

and performance of transducers for thou- sands of applications in modern technology.

The measurement of pressure from sub- atmospheric to 700 MPa and above with uncertainties of tens to hundreds of parts per

million is essential in modern technology.

The most fundamental instrument at these high pressures is the deadweight piston gauge. In the piston gauge, a force generated in a working fluid acts against the surfaces of a piston and against the walls of a cylinder that confines the piston. At high

pressures, the materials undergo significant

distortion, which leads to limitations and

uncertainties in the area on which the fluid

is acting. The fluid interacts with the side of the piston, creating upward forces that are

difficult to interpret. NIST scientists are using various tools to understand these

effects. Examples include finite-element

analysis to characterize distortion, better hydrodynamic measurement and modeling

of the annular region through which the

fluid flows, and improved piston gage

designs.

Contact:

Charles D. Ehrlich

(301) 975-4834

email: chuck@micf.nist.gov A55 Metrology Building

VACUUM AND LEAK

STANDARDS

Many industries depend on accurate vac- uum (pressure) and leak measurements fr research and development and for process and quality control. NIST develops and

maintains pressure and vacuum standard] from above atmospheric pressure to ultra- high vacuum; leak or flow standards are ' operated from 10"^ to below 10'^ std cm^/)'

Facilities include five ultrahigh vacuum

systems; two low-range flowmeters; high- accuracy mercury manometers; pressure and vacuum control systems; and vacuurte

electronic, data acquisition, and data mi

sis equipment.

These facilities and measurement capabi|

ties enable researchers to develop improv^| measurement techniques and equipmentj, and to investigate the performance of vac uum and pressure equipment, specifically mechanical pressure gauges, momentum

j transfer gauges, ionization gauges, stand

leaks, and residual gas analyzers. In

addition, NIST plans to use this measure ment capability to investigate properties

of materials and physical phenomena of fundamental interest. Among the plannei

projects is the development of reference standards for the transition regime betwt low pressures measured by mechanical o electromechanical gauges and pressures measured by vacuum technology devices The development of accurate methods to measure and characterize ultrahigh vac- uum systems is also under investigation.

Contact:

Charles R. Tilford

(301) 975-4828

email: crt@micf.nist.gov A55 Metrology Building
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY 61

I

RESEARCH

FACILITIES

^ATER FLOW

MEASUREMENT FACILITY

e NIST water flow measurement facilities

e ijsed to establish, maintain, and dissemiite flow-rate measurements, standards,

id data for the wide range of conditions

ried by U.S. industry. Industn' requests

elide flowmeter calibrations, round-robin

ting programs to establish realistic trace-

:.:t\' chains in the form of flow measureI jent assurance programs, data-generation osrams for industrial groups and trade

i ciations, and testbeds for carr\'ing out

dustrial research programs focused on

)\v measurement topics.

LABILITIES

rr flow facilities enable flow rates up to

.000 liters/min in pipe sizes that range up

; 500 mm in diameter. Maximum operat-

' "g pressure is 1 MPa. Flow rate determinar. schemes use static and dynamic

a', imetric systems.

'PLICATION

ie>e facilities are used to establish and

- aintain the national bases for the liquid

)w-rate measurement systems. The end

iu!t is orderliness in the marketplace,

;h domestically and internationally, for

S. industries involved in the custody trans-

" and/or process control of valuable fluid

-ources and products. Potential users

elude the National Aeronautics and Space

ministration, the Department of Defense,

e oil and gas industries, the chemical and

lated industries, and the power and

ergy-generation industries.

AVAILABILITY The facilities are available upon request to

U.S. industry, other government agencies,

and academia for collaborative research

projects and calibrations.

Contact: George E. Mattingly

(301) 975-5939

email: gem@micf.nist.gov

105 Fluid Mechanics Building

FLUID METERING

RESEARCH FACILITY

The NIST Fluid Metering Research Facility combines primar\' calibration techniques

with the capability to conduct detailed surveys of fluid velocity profiles in temperaturecontrolled water flows using laser Doppler

velocimetn,' (LDV)

.

LDV is a non-intrusive technique for deter- mining the fluid velocity at a particular location in the flow. It enables pipeflows to be surveyed for a wide range of piping configurations in pipe sizes up to 20 cm in diameter. Temperature control enables stable fluid and flow conditions to be established and maintained for extended test

periods. The primary calibration technique

uses dynamic gravimetric methods to deter- mine accurately the bulk liquid flow rate.

CAPABILITIES Water flow rates up to 240 liters/min in a range of pipe sizes up to 20 cm in diameter can be produced. Maximum operating pressure is 0.5 MPa, and temperature can be stabilized in the range from l6 °C to 30 °C.

APPLICATIONS

This facility is used to conduct calibrations,

special fluid measurement tests, or selected research programs on flow topics. An

industr)'-government consortium currently supports a research program on flowmeter

installation effects, and the U.S. Navy is

sponsoring a series of tests to assess the per- formance of selected flow transfer standards

in a range of non-ideal installation conditions.

The facility is used to generate critical databases used to initiate or update the national standards on generic fluid-metering topics. These standards are used for accurate cus- tody transfer of fluid resources or products

in the domestic and international marketplace or for process control in chemical manufacturing processes. Among the potential users of the facility are the Department

of Defense, the National Aeronautics and

Space Administration, the oil and gas industries, the engine manufacturing and testing

industries, and the energy-generation

industries.

AVAILABILITY These facilities are available upon request

to U.S. industry, other government agencies, and academia for collaborative research

projects or calibrations.

Contact: George E. Mattingly

(301) 975-5939

email; gem@micf.nist.gov

105 Fluid Mechanics Building

NITROGEN FLOW

MEASUREMENT FACILITY

The nitrogen flow measurement facility is a mass-based reference system capable of both

liquid and gas flow measurement. Well instrumented for temperature and pressure,

the facility is adaptable and capable of a

variety of piping arrangements. Located completely indoors, it is not subject to envi- ronmental changes.
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

CAPABILITIES When configured for gas flow measurements, the facility has a flow-rate range of

0.5 kg/s to 2.4 kg/s. In this mode, the nitro- gen gas is at pressures of approximately

4 MPa and temperatures of approximately 288 K. The facility has a flow-rate range of

0.05 kg/s to 10 kg/s when set up for liquid flow measurements. Liquid nitrogen can be

at pressures up to 0.7 MPa and temperatures between 80 K and 90 K in this configuration. This continuous-flow facility permits

dynamic mass flow measurements. For vol- ume flow measurements, density is deter- mined by making pressure and temperature measurements and calculating density from

an equation of state.

APPLICATIONS The nitrogen flow facility can be used for

testing a variety of flow measurement

instrumentation, including flowmeters, temperature sensors, pressure sensors, and densimeters. The ability to operate the facility

at stable conditions for long periods of time

permits testing of instrumentation stability. The ability to vary system parameters per- mits testing of instrument sensitivity.

AVAILABILITY

Collaborative or independent programs for

this test facility can be arranged. The facility must be operated by NIST staff.

Contact:

Patricia J. Giarratano

(303) 497-3110

email; pjg@micf.nist.gov

Division 836.06

Boulder, Colo. 80303-3328

NEUTRON DEPTHPROFILING FACILITY

NIST operates two world-class neutron

depth-profiling (NDP) instruments for the non-destructive evaluation of elemental

depth distributions in materials. Working

with the Institute's 20-megawatt nuclear

reactor, researchers use the technique to provide concentration profiles for characterizing the near-surface regime of semiconductors, metals, glasses, and polymers to depths of several micrometers.

The first of the two instruments began

operation in 1983. It uses a thermal neutron beam line, sapphire filters, and colli- mators to produce a high-quality beam with good thermal neutron intensity and mini- mal contamination with fast neutrons and

gamma rays. The second instrument, which

began operation in 1991, is part of the Cold Neutron Research Facility at NIST. (See page 88 under Materials Science and Engineering Laboratory.) Taking advantage of a

liquid hydrogen moderated neutron beam,

it has the highest reaction rate of any similar analytical neutron facility in the world.

In both cases, an evacuated target chamber

is used to analyze sample sizes from 1- to 200-mm diameter or greater. This means,

for example, that entire silicon wafers are analyzed without the need to sacrifice them. A full array of electronic components is available for sample positioning, data

acquisition, and analysis.

CAPABILITIES Using the neutron beam provided by the

reactor, depth profiling can be carried out with detection limits approaching

1 A 9 10 atoms/cm". A single analysis produces

a profile typically 1 |im to 20 ]im deep with

a resolution of better than 20 nm. Analysis

of the sample can take from minutes to

hours depending on the information

requested. Once calibrated with the appro

priate elemental standard, the concentration scale is fixed independently of the sample composition, unlike most destructive analytical techniques. Elements that dc- not produce charged particles under neutron irradiation contribute no interference

to the profile.

APPLICATIONS

Applications of NDP include range measun' ments for boron implanted in Si, GaAs, anoi other semiconductor materials; observation

of the near-surface boron distribution in

glasses; lithium concentration profiles in lithium niobates, tantalates, and aluminui

alloys; measurement of high-dose nitrogen

implants in steels; dopant and thickness determination of diamond films; and, mos

recently, profiles of oxygen- 17 in a variety

of materials. NDP is used to produce refer- ence materials used in industry and at otb

analytical facilities.

AVAILABILITY The facility is available to all qualified researchers on an independent or coUabor

tive basis with NIST staff.

Contact:

R. Greg Downing

(301) 975-6286

email: downing@enh.nist.gov B125 Reactor Building
PHYSICS LABORATORY

Attending to the long-term needs of many

U.S. high-technolog}' industries, NIST's

Physics Laboratory conducts basic

research in the areas of quantum, electron, optical, atomic, molecular, and

radiation physics. This research is complej raented by work in quantum metrolog}'

! and efforts to improve the accuracy and

precision of time and frequency standards.

Much of the laboratory's research is devoted to overcoming the barriers to the

next technological revolution, in which

individual atoms and molecules will serve

as the fundamental building blocks of

electronic and optical devices. To develop

the necessar}' measurement capabilities

for these new products, laborator\' scientists are using highly specialized equipraent, such as polarized electron microscopes, scanning tunneling microcopes, and a synchrotron radiation

: Durce, to study and manipulate individual atoms and molecules.

iO support of industries ranging from

photography to aerospace to lighting, the

' aborator\' is working to improve optical Measurement techniques used in remote

sensing, advanced color graphics systems, and optically pumped atomic clocks. Research also is focused tov,'ard advance- ments in the measurement and dosimetry'

l izing radiation used in medicine

ji.iu industry, and supports the developnent of emerging technologies, such as

[•rray lithography, digital X-ray imaging,

lid electron beam processing.

"mtact: atharine B. Gebbie, Director 301) 975-4201

mail: gebbie@micf.nist.gov «: (301) 975-3038

160 Physics Building

COOPERATIVE RESEARCH

OPPORTUNITIES

Electron and Optical Physics

64 UV Optics Testbed 64 Vacuum Ultraviolet Photodiodes

for Radiometry

Atomic Physics

64 Vacuum Ultraviolet Radiometry 64 Ctiaracterization of Low-Temperature Plasmas

65 EBIT Facility for Research on

Higfiiy Ionized Atoms

65 Laser Cooling and Trapping 65 Higfi-Precision Laser Spectroscopy

Molecular Physics

66 Higfi-Resolution Molecular Spectroscopy 66 Molecular Dynamics

66 Molecular Tfieory

Radiometric Physics

66 Luminescence Spectral Radiometry 67 Ptiotometry 67 Cryogenic Radiometry 67 Tfiermal Radiometry 67 UV Radiometry 67 Spectral Radiometry 67 Infrared Spectral Radiometry 68 Bidirectional Scattering Metrology

Quantum Metrology

68 Study of Atomic Structure of Matter

witfi X-Rays 68 Higti-EnergyX-Ray Spectroscopy 69 Production and Characterization of Synthetic Multilayers 69 Pre-Flight and Post-Flight Calibration

Ionizing Radiation

69 Radiation Processing 69 Industrial Radiologic Imaging 70 Measurement Quality Assurance

70 Neutron Fluence Measurement and

Neutron Physics

Time, Frequency, and Lasers

70 High-Performance Diode Lasers

71 Time Transfer and Network

Synchronization

71 Phase Noise in Electronic and Optical Systems

71 Statistical Analysis of Time-Series Data

71 Far-Infrared Spectroscopy

Quantum Physics

72 Laser Studies of Semiconductor

Materials

72 Laser Stabilization

72 Silicon Thin Films 72 Visiting Fellowship Program

RESEARCH FACILITIES

73 Synchrotron Ultraviolet Radiation

Facility II 73 High-Resolution UV and Optical Spectroscopy Facility 74 Low-Background Infrared Radiation

Facility

74 Electron Paramagnetic Resonance

Facility

75 Radiopharmaceutical Standardization Laboratory 75 Magnetic Microstructure Measurement

Facility
PHYSICS LABORATORY

COOPERATIVE RESEARCH

OPPORTUNITIES

ELECTRON AND OPTICAL

PHYSICS

Division Contact:

Charles W. Clark

(301) 975-3709

email: charles@micf.nist.gov

fax: (301) 975-3038 A253 Physics Building

UV OPTICS TESTBED

The emerging field of high reflectance, normal incidence, soft X-ray/extreme ultraviolet (xuv) optics has a wide range of applications. The ability to produce high-quality

images at wavelengths below 40 nm has

allowed construction of xuv solar telescopes with unprecedented resolution, xuv microscopes able to study living biological samples with submicron resolution, and xuv

photolithographic systems that will produce

the next generation of integrated circuits.

NIST has initiated an xuv multilayer characterization facility at the SURF II electron storage ring, which is available to all researchers on a cooperative basis. The pres- ent facility is capable of measuring the re- flectance or transmission of xuv optics

(such as mirrors, filters, and gratings) as a

function of wavelength, angle of incidence,

and position on the optic from 8 nm to 60 nm, NIST is constructing a new facility that will extend measurement capabilities

to shorter wavelengths, larger substrates, and more highly curved optics and, at the same time, increase resolution and accuracy. An optical testbed is also being constructed to measure the imaging properties

of individual optics and entire optical sys- tems. The first element of this testbed will be a quasi-real-time imaging device with a resolution goal of 25 nm.

Contact: Richard N. Watts

(301) 975-6892

email: watts@enh.nist.gov A253 Physics Building

VACUUM ULTRAVIOLET

PHOTODIODES FOR

RADIOMETRY

Highly stable photodiode detectors with uni- form spatial sensitivity are developed, calibrated, and distributed as transfer standard

detectors for radiometry in the wavelength

region of 5 nm to 250 nm. Presently avail- able detectors at NIST include AI2O3 photo- cathode windowless photodiodes for the region 5 nm to 120 nm, CsTe photocathode

windowed (evacuated) photodiodes for the region 115 nm to 250 nm, and silicon photodiodes, developed in collaboration with industry, for the region 5 nm to 49 nm. Some other types of detectors can be cali- brated by special arrangement. Broadband

photometers have also been developed in collaboration with outside users and cali- brated in this spectral region, e.g., combinations of silicon photodiodes with thin-film

filters for plasma diagnostics and vacuum

ultraviolet solar radiometry.

Contact:

L. Randall Canfield (301) 975-3728

email: canfield@enh.nist.gov BII9 Radiation Physics Building

ATOMIC PHYSICS

Division Contact: Wolfgang L. Wiese

(301) 975-3201

email: wiese@micf.nist.gov

fax: (301) 975-3038 A267 Physics Building

VACUUM ULTRAVIOLET

RADIOMETRY

As part of its research to understand and

measure various forms of radiation, NIST

conducting vacuum ultraviolet studies involving radiation damage, polymerizatid;

of organic molecules, and solar simulatioi NIST scientists have worked with researchers from industry to develop and test vac uum ultraviolet instrumentation, new

spectrometer designs, and detector systems; especially for flight in space. They also ha\

collaborated on special sources, narrow- band filters, and lasers. NIST scientists are interested in doing cooperative research in several other areas, including studying ho

low cathode lamps, laser plasmas, and

spark-discharge light sources as secondar)

standards. State-of-the-art radiometric

facilities and advanced optical equipment:

are available at NIST for these studies.

Contact: • \

J. Mervin Bridges (301) 975-3228 AI67 Physics Building

I

CHARACTERIZATION OF { LOW-TEMPERATURE

PLASMAS

The properties of low-temperature plasma

play a key role in the processing of materials such as semiconductors. Proper charj

terization of these plasmas is essential to develop accurate plasma diagnostics and

useful plasma models for specific applica

tions. At NIST, plasma discharges are
PHYSICS LABORATORY

llu'acterized utilizing optical emission

jctroscopy, laser-induced fluorescence,

isr scattering, and optogalvanic methods,

ideling of the plasma is also an integral

1 of this characterization. Discharge

arces include low-pressure rf plasmas,

oilized arcs, glow discharges, heat pipes

Ih laser resonance ionization, and induc-

;ly coupled plasmas.

extensive array of laboratory' equipment

.vailable to accomplish this characzation, including several Nd:YAG

tnped, high-resolution (<0.1 cm"^) dye

°rs; Ar ion-pumped dye and ring dye

£rs; a Fizeau wavemeter; a highbughput (f/4), high-resolution

001 nm) spectrometer with an autoted intensified diode array detector; an

d[ifMHz quadrature He-Ne laser interfero-

•iter; uv spectrometers; grazing incidence

ctrometers; laboratorv' computers; and

icellaneous optics. The principal quanti- measured are particle density distribuis—both spatially and temporally—for

ptrons, atoms, ions, and molecules. Also luded are electric-field distributions,

:ptron and ion temperatures, and

i-equilibrium phenomena.

'1 \ itact:

aes R. Roberts

'1) 975-3225

ail: jroberts@micf.nist.gov

l'7 Physics Building

IIT FACILITY FOR

ESEARCH ON HIGHLY

INIZED ATOMS

'T's new electron beam ion trap (EBIT)

ice provides many opportunities for

mitive measurements aimed at a basic

i jlerstanding of plasma processes and

Tiic structure. In addition, possibilities

. using the new source for nanofabrica1 and ion lithography currently are

1^ considered. Ions can be generated

over a wide range of species and charge

states (ultimately up to fully stripped ura- nium). Ions are trapped radially and probed

with a mono-energetic electron beam. Electrostatic end caps confine the ions axially. A

large magnetic field is applied by a super- conducting magnet to pinch the electron beam to high density and provide additional

radial trapping. The carefully controlled conditions in EBIT allow scientists to unravel complex collision processes and measure spectra with very high accuracy. Highly charged ions can be produced at low

temperatures and observed in fluorescence with adequate brightness. The ion temperature can be further lowered by evaporative

cooling techniques. A variety of instruments

are available to characterize and probe the trapped ions, including X-ray spectrometers and a new laser system. Plans are under way

to build an extraction system for directing

beams of highly charged ions onto surfaces.

Contact: John D. Gillaspy

(301) 975-3236

email: gillaspy@enh.nist.gov

Al67 Physics Building

LASER COOLING AND

TRAPPING

Thermal motion of atoms often adversely

affects measurements. Using the radiation

pressure from near-resonant laser beams, NIST scientists can cool a gas of atoms to within a few microdegrees of absolute zero. These cold atoms can be trapped by laser beams or other electromagnetic fields.

Facilities for cooling and trapping atoms

include cw dye, solid-state, and semi- conductor lasers. Atoms are trapped in laser

traps, magneto-optical traps, and micro- wave traps. Sodium, rubidium, cesium, and xenon atoms are cooled, trapped, and used

in such diverse applications as atomicfountain frequency standards and studies of

laser-modified chemical reactions. Control

of atomic motion by lasers is also being

applied to problems such as atom inter- ferometry and laser-directed deposition of atoms on surfaces.

Contact: William D, Phillips (301) 975-6554 AI67 Physics Building

HIGH-PRECISION LASER

SPECTROSCOPY

Highly stabilized tunable lasers permit the investigation of atoms and molecules with a

level of detail and precision that cannot be obtained with conventional spectroscopic

techniques. NIST work in this area ranges from observations of laser ionization of diatomic molecules in dense vapors to highly precise wavelength measurements

that test the most advanced atomic theories

for simple atoms. The high resolution pro- vided by laser scanning permits study of

spectral line profiles, including pressure broadening, isotope shifts, and hyperfine

structure. Sensitive detection techniques,

including FM and optogalvanic spectros- copy and use of thermionic diode detectors, permit observation of low concentration

species in discharges and vapor cells. Typical applications of these data include wavelength standards, detection of trace elements in samples, and laser isotope

separation. Facilities include stabilized

lasers that are tunable from the near ultraviolet to near infrared and a unique FabryPerot wavemeter that is capable of real-time

laser wavelength measurements with an

accuracy of a few parts in a billion.

Contact: Craig J. Sansonetti

(301) 975-3223

email: sans@enh.nist.gov AI67 Physics Building
PHYSICS LABORATORY

MOLECULAR PHYSICS

Division Contact: Richard D. Suenram

(301) 975-2165

email: suenrm@tiber.nist.gov

fax: (301) 975-3038 B266 Physics Building

HIGH-RESOLUTION

MOLECULAR

SPECTROSCOPY

The NIST high-resolution spectroscopy group employs advanced spectroscopic methods using state-of-the-art lasers and micro- wave frequency sources in conjunction with molecular beam techniques to elucidate the

details of chemical reactions that are important in a wide variety of industrial processes, including catalysis, combustion, chemical vapor deposition, and drug design. These benchmark studies provide means for real- time optimization of chemical processes and on-line monitoring for pollution

control.

The group also carries out spectral studies

of species important in atmospheric processes with particular emphasis on the reaction chemistiT of ozone. The work provides

spectral data for these species, which are used by scientists modeling the chemistry of

the upper atmosphere. A recent thrust of the group centers around the determination of physical and electrical properties of numerous new chemical compounds that are being investigated by industiy for use as

alternative refrigerants.

Contact: Richard Suenram

(301) 975-2165

email: suenrm@tiber.nist.gov

B266 Physics Building

MOLECULAR DYNAMICS

The NIST molecular dynamics group employs sophisticated laser techniques and

pulsed molecular beam nozzles to investi- gate the dynamics of chemical reaction mechanisms on picosecond and femto- second time scales providing new insights

into the details of reaction mechanisms

with extremely high time resolution. The

reactions being studied include those important in combustion processes, upper atmospheric chemistiy, and catalysis.

Contact: John Stephenson

(301) 975-2372 B266 Physics Building

MOLECULAR THEORY

The NIST molecular theory group is developing new algorithms and theoretical methods

in time-dependent quantum dynamics. These methods are being applied to describe

collisional phenomena currently being

observed in ultracold neutral atom traps, which ultimately will lead to the next generation of atomic clocks. Describing these novel collisions requires development of methods that can describe the quantum evolution of a system while it is interacting and

exchanging energy with its environment.

In laser cooling phenomena, the energy exchange is due to the dissipative process of spontaneous decay of excited states. The new theoretical methods are expected to find widespread applicability to many areas

of chemistr)' and physics, such as reactions

in condensed media or electron transport in nanoscale devices. Implementing these new

methods will greatly benefit from the devel- opment of state-of-the-art massively parallel processing computers.

Contact: Paul Julienne

(301) 975-2596

email: pjulienne@nist.gov

B268 Physics Building

RADIOMETRIC PHYSICS

Division Contact:

Albert C, Parr

(301) 975-3739

email: parr@enh.nist.gov

fax: (301) 840-8551

A3 17 Metrology Building

LUMINESCENCE

SPECTRAL RADIOMETRY

Luminescence techniques have broad app

cation in virtually every scientific field including radiation measurement, remotesensing, quantitation of biomolecules by

intrinsic luminescence and immunoassay

techniques, and characterization of laser, semiconductor, and superconductor mate

rials. The accurate spectral radiometric

quantitation of light emission is an exact ing task requiring painstaking radiometri measurements and knowledge of the func mental chemical and physical processes represented by these radiative transitions Standard lamps, both radiance and irradi ance, and silicon detector radiometry pro

vide the accuracy base for the spectral anc quantum efficiency measurements. Lumi

nescent phenomena under investigation i. NIST are photo-, chemi-, thermo-, electro' and bioluminescences. NIST researchers

conducting luminescence radiometric re search in the near-ultraviolet, visible, an(

near-infrared spectral regions and are de

oping accurate standards and measurem(

procedures for these regions. Facilities av'

able for this research include various Ias6 and lamp sources, the NIST reference spectrofluorimeter, and a low-light-level

spectroradiometer now under constructio

Contact: i Ambler E. Thompson

(301) 975-2333

'

email: ambler@enh.nist.gov

\ A3 17 Metrology Building
PHYSICS LABORATORY

f Photometry THERMAL RADIOMETRY SPECTRAL RADIOMETRY

|otometr\' is the application of radiojitric measurement to human vision. NIST

jearchers recently have improved the accuof the SI base unit for photometry, the

fidela, by realizing the scale based on

liolute detectors. The candela is a unit of

tasure of the apparent brightness of a - M source as obser\'ed by the human eye.

lie arch continues in the application of the

nector-based candela to improving other ptometric scales, such as luminous flux

jljiJ luminance. Additionally, NIST researchare applying photometry to new measjltment problems, such as the colorimetr}'

d perceived qualit}' of flat-panel displays,

{pperative research opportunities exist in

; aspects of photometric measurements, as

J.1 as psychophysical and related humanItor issues as might apply to product

iliigns and improvements.

- ':.hi Ohno

»1) 975-2321

"lail: ohno@gamet.nist.gov

Metrology Building

I 3

r^YOGENIC RADIOMETRY

.asurement of optical power by electrical

)stitution is improved at cr\'ogenic temjiatures. A cryogenic radiometer designed

high accuracy forms a basis for NIST

ical scales, with a measurement uncerity of 0.01 percent. Other cr^'ogenic radieters are employed to measure lower

es and faster flux changes. Ongoing

r.s to further develop this measurement

nique include studies into new methods

r ogenic thermometn,', such as the

-lie inductance bolometer, and better

iiaraic modeling of radiometer designs.

iitact:

iathan E. Hardis

1) 975-2373

ail: hardis@enh.nist.gov

;7 Metrology Building

NIST researchers are investigating the use of thermal imaging cameras as a temperaturemeasuring tool. These devices may prove to be very useful in determining the quality of products and in investigating changes in different processes. Research projects involve the development of large-area blackbodies, use of Pt-Si as detector standards, and the characterization of thermal imaging cameras. Equipment available includes several heat-pipe blackbodies, a Pt-Si camera, and

an infrared radiometer.

Contact: Robert Saunders

(301) 975-2355

email: rds@micf.nist.gov

B208 Physics Building

UV RADIOMETRY

The measurement of terrestrial solar irradi- ance in the uv-b spectral region is being

investigated by NIST researchers to provide

improved techniques and standards in this

region. This work is of importance not only

to scientists studying biological effects but

to researchers investigating the aging of materials by uv light. Specific projects include the development of a reference

spectral radiometer, broadband detectors, and source standards in the region. A high- accuracy spectrometer, standard detectors, and standard sources are available.

Contact: Ambler Thompson

(301) 975-2333

email: ambler@enh.nist.gov A317 Metrology Building

Research and development programs at NIST span many activities associated with

the measurement of optical radiation, cover- ing the spectrum from 200 nm in the ultraviolet to the far infrared. Included are

spectral radiance and irradiance measure- ments for many varied applications, such as manufacturing process control, remote sens- ing of the Earth's environment, and defense

needs. Researchers at NIST take demanding

problems, such as the spectrophotometric measurement of dense optical media, and

develop the detector metrology to perform

the measurements and relate them to the

stable, U.S. radiometric measurement base. Emphasis is placed on solid-state photodiode metrology and its application to all areas of radiometry, especially calibration

services.

Several well-equipped laboratories for optical measurements in the uv, visible, and

ir spectral regions are available for use, and new facilities are under development to enable scientists and engineers to conduct

research on detector improvements, detector

applications, and optical properties of

materials.

Contact:

Chris Cromer

(301) 975-3216

email: cromer@micf.nist.gov

B208 Physics Building

INFRARED SPECTRAL

RADIOMETRY

Researchers at NIST are developing devices and techniques for high-precision measure- ments of radiant power in the 2 ^im to 30 |J.m spectral region to enable characterization of spectral sources, optical components, and detectors. Novel experiments are being planned to investigate physical and
PHYSICS LABORATORY

chemical processes in materials and molecular structures. State-of-the-art radiometers, a ci70genic blackbody with multiple apertures, lead salt lasers, spectral instrumentation, and solid-state infrared detectors are being acquired. A unique facility called the Low Background Infrared Radiation Facility

is dedicated to this research and develop- ment effort. An Infrared Detector Comparator Facility, equipped with a prism-grating

monochromator and an FTIR spectrometer

for characterizing detectors at ambient back- ground, is nearing completion.

Related research projects are investigating

methods for measuring the optical density

of filters using laser heterodyne technology

and determining the spatial uniformity and

linearity in the response of infrared detectors. Collaborative research opportunities

exist in measuring the optical properties of materials and fundamental molecular structures and in developing novel detectors.

Contact: Raju Datla

(301) 975-2131

email: rdatla@micLnist.gov

B208 Physics Building

BIDIRECTIONAL

SCAHERING METROLOGY

The bidirectional characterization of optical

scatter from surfaces is a useful diagnostic

in evaluating elements contained within

large optical systems that require the minimization of scattered light. This infor- mation is needed for the development of

ring-laser gyroscopes, telescopes, and super- polished mirrors. It is used also for the characterization of materials for use in stray

light reduction in thermal control and

inspection processes in optical manufacturing settings. NIST research projects involve

the development of a multiangle scattering

reference instrument and the development of

measurement methodologies and Standard

Reference Materials for the spectral range from the ultraviolet to the infrared region.

Contact: Clara Asmail

(301) 975-2339

email: asmail ©omoc.nist.gov A317 Metrology Building

QUANTUM METROLOGY

Division Contact: Richard D. Deslattes (301) 975-4841

email: deslatte@micLnist.gov

fax: (301) 975-3038

Al4l Physics Building

STUDY OF ATOMIC

STRUCTURE OF MAHER

WITH X-RAYS

X-ray spectroscopy provides information on

electronic structure and on the local atomic

structure of atoms in matter. A synchrotron

radiation beamline has been constructed by NIST scientists at the National Synchrotron

Light Source (NSLS) at Brookhaven National Laboratory in New York, providing

the highest flux, intensity, and energyresolving power of any existing beamline

in the X-ray energy range from 500 eV to 5000 eV. NIST equipment complements the synchrotron radiation instrumentation. X-ray absorption spectroscopy techniques, such as X-ray absorption near-edge structure and extended X-ray absorption fine

structure, have been used to determine the atomic structure of metals, semiconductors,

polymers, catalysts, biological molecules, and other materials of interest to industry.

Researchers also use X-ray emission spec- ; troscopy. X-ray photoelectron spectroscopy, and Auger electron spectroscopy to probe the electronic structure of solids, liquids, or

gases.

The X-ray standing-wave technique uses

interference between incident and diffracted X-rays to determine the precise location of impurities or imperfections within a crystal or at its interfaces. The technique can be

used with semiconductors or optical crystals, growth of overlayers on crystals, and

the structure of catalysts supported on crys

tal substrates. In addition, evanescent

X-rays, which penetrate only a few nanome^

ters from an interface, can be controlled to study chemical composition in the vicinity

of an interface.

i

I

NIST scientists recently pioneered a new

technique, diffraction of evanescent X-rays, which combines and extends the capabili

ties of the X-ray standing-wave method anc experiments based on evanescent X-rays. The synchrotron radiation beamline pro

vides an ideal facility for applying these techniques.

Contact: Richard D. Deslattes (301) 975-4841

email: deslatte@micLnist.gov Al4l Physics Building

-V

3

HIGH-ENERGY X-RAY

SPECTROSCOPY

NIST researchers have developed highly

accurate spectroscopic instrumentation for measurements from the keV region to several MeV. This measurement system is connected to the basic SI units of frequency ani

length by means of X-ray interferometry

and a precise lattice comparator. Main

applications include accurate secondary

standards in the X-ray and gamma-ray

region and spectroscopic measurement of high voltage.
PHYSICS LABORATORY 69

mie variety of instrumentation is availle, and collaborative applications of these

pabiiities to technically significant prob- ms are welcomed.

nitact: ©est G. Kessler

lOl) 975-4844

lail: kesslere@enh.nist.gov

41 Physics Building

fiODUCTIONAND

CHARACTERIZATION OF

YNTHETIC MULTILAYERS

response to the need for short- Ivelength characterization of multilayer

nictures for larger wavelength X-ray

tics, NIST researchers have established a gh-performance multi-axis diffractome-

". This system provides highly coUimated

d monochromatic X-ray beams, which,

cer reflection from the structure under

jdy, can be examined for both specular

^d non-specular reflection characization. The normal operating waveagth is 0.154 nm, and the on-scale

declivity covers a range of six decades.

association with this program, the

searchers have established a thin-film proiction facilit}' capable of handling a wide

irietv' of materials in the range of thick- — - sses from near one monolayer to a

icrometer. The production process uses

1 beam sputtering with simultaneous

vasi-neutral beam milling to produce thin

yers of exceptional uniformity.

mtact: chard D. Deslattes 01) 975-4841

aail: deslatte@micf.nist.gov

41 Physics Building

PRE-FLIGHTAND

POST-FLIGHT CALIBRATION

Significant numbers of X-ray instrumented

satellites have been placed in Earth orbit, and more are planned. The flexible laboraton'-based capabilities established in

this division have been made available to support several missions. In addition to earlier work on the Solar Maximum Mission and P78-1, NIST researchers have made

important contributions to currently orbit- ing observatories, including the Japanese

satellites Yohkoh and ASTRO-D. They recently completed detector characterization

for the Broadband X-ray Telescope and are currently focusing on the bolometer detector

for the Advanced X-ray Astronomy Facility.

Contact:

Larr)' Hudson

(301) 975-2537 Al4l Physics Building

IONIZING RADIATION

Division Contact: Randall S. Caswell

(301) 975-5525

email: caswell@raicf.nist.gov

fax: (301) 869-7682 C229 Radiation Physics Building

RADIATION PROCESSING

To enhance quality-control methods used in

industrial radiation processing of foods and

in the production and use of medical

devices, electronic components, and poly- mers, NIST researchers are developing standardization and measurement assurance methods related to industrial high-dose

applications of ionizing radiation. As part of

this program, Institute scientists are investi- gating radiation chemical mechanisms and

kinetic studies applied to chemical

dosimetry systems in the condensed phase,

including liquids, gels, thin films, and solidstate detectors.

They also plan to examine sensor materials, such as doped plastics, solid-state matrices,

fiber optics, organic dye solutions, semiconductors, scintillators, amino acids, metalloporphyrins, and organic or inorganic radiochromic and luminescent aqueous

solutions and gels. A number of analytical

methods will be used, including transmission and fluorescence spectrophotometry,

electron spin resonance spectrometry, and

chemiluminescence spectrophotometry,

as well as optical waveguide analysis, microcalorimetry, pulse radiolysis, laser- induced photochemistry, and conductivity measurements.

Various X-ray and gamma-ray sources and

electron accelerators with energies in the 0.1-MeV to 10-MeV range are used in this work. Conventional ultraviolet, visible, and

infrared spectrophotometers and spectro- fluorimeters, high-intensity gamma-ray

sources, pulsed and continuous beam electron accelerators, and organic-chemical

analytical equipment also are available.

Contact: William L. McLaughlin

(301) 975-5559 C229 Radiation Physics Building

INDUSTRIAL RADIOLOGIC

IMAGING

The use of penetrating radiation for imaging is one of the most powerful investigative techniques available to industry for maintaining or improving the quality of products. Designers who are aware of this are

creating components that facilitate such

non-destructive testing. Research is under way at NIST to allow better quantification

of radiographic images. Particularly rele- vant to image evaluation are computerbased systems that permit pseudo three- dimensional images and the implementation of image processing on these or traditional images in real time or near real time.
PHYSICS LABORATORY

NIST research focuses on image processing

for improved imaging of low contrast for noisy images, adaption of tomograpfiic

equipment to industrial needs and measure- ment of the performance characteristics of such systems, and development of reliable techniques for image storage and retrieval. Available equipment includes X-ray sources, low-energy electron accelerators, gammaray sources, and state-of-the-art radiologic

imaging devices.

Contact:

Charles E. Dick

(301) 975-5580 C229 Radiation Physics Building

MEASUREMENT QUALITY

ASSURANCE

Credibility of ionizing radiation measure- ments has been a critical issue for the U.S. radiation medical diagnostics and therapy,

occupational safety, industrial, energy,

defense, and environmental communities. To this end, NIST scientists disseminate the standards and technology required for reli- able measurement of ionizing radiation to

federal, state, and local radiation control programs as well as to the medical, industrial, and defense communities, hi addition, NIST researchers monitor and evaluate

radiation measurements needs; participate

in radiation research, metrology develop- ment, and quality control activities; and

develop methods for improving the accuracy

of field measurements through a national system of secondary standards laboratories.

NIST has a strong influence on the design

and implementation of measurement quality assurance programs that are accredited under the National Voluntary Laboratory

Accreditation Program (secondary calibration laboratories for ionizing radiation and

personnel dosimetry programs), the Confer- ence of Radiation Control Program Directors (diagnostic X-radiation), Health

Physics Society (private-sector calibration

laboratories), and American Association of

Physicists in Medicine (therapeutic radiation). Programs currently being developed

will address MQA needs in sectors that include industrial processing, radiobioassay, and radioanalyses for environ- mental remediation and waste management.

In support of the accreditation programs, NIST provides technical expertise for laboratory technical document review and evaluation, traceability to the national physical standards through performance evaluation

testing, and on-site assessments. The major

research thrust is the development of a wide

variety of appropriate transfer standard

instruments and materials.

Contact: Kenneth G.W. Inn

(301) 975-5541

email: keninn@micf.nist.gov

C229 Radiation Physics Building

NEUTRON FLUENCE

MEASUREMENT AND

NEUTRON PHYSICS

NIST researchers are studying industrial applications of neutron fluence and dose determination in the neutron energy region from thermal to 20 MeV. They are developing effective methods to transfer personnel

protection technology to the private sector. This research provides a basis for stand- ardizing personnel protection control proce- dures in nuclear reactor and high-energy

accelerator operations. Specific research

involves the measurement of reference standard neutron reaction cross sections, characterization of reference fission deposits, development of neutron detectors with

fast timing, and calibrations using standard

neutron and gamma-ray fields. Equipment

available includes a 100-kV ion generator- based 2.5-MeV neutron source, a 3-MV

pulsed positive-ion accelerator, and a 20-MW nuclear reactor.

Contact: Oren A. Wasson

(301) 975-5567

email: wasson@micf.nist.gov C311 Radiation Physics Building

TIME, FREQUENCY, AND

LASERS

Division Contact: Donald B. Sullivan

(303) 497-3772

email: dbs@micf.nist.gov

fax: (303) 497-6461

Division 847.00

Boulder, Colo. 80303-3328

1

HIGH-PERFORMANCE

DIODE LASERS

i

Diode lasers are now widely used in many

applications where spectral and spatial purity is not critical, but they could be usee

in a variety of other applications if these

properties were improved substantially.

Such applications include analytical chem'

istry and sensing of trace impurities or pollutants as well as narrow-line sources for length standards and optical manipulation

of atoms and molecules. Recognizing the broad range of measurement applications

for high-performance diode lasers, NIST

started a program aimed at developing

methods for controlling the output charac-;

teristics of these versatile and inexpensive ,

lasers. The program selects specific practic

applications and works on the system

designs needed to provide solutions. Currei

projects include a calcium-stabilized laser
PHYSICS LABORATORY 71

-1- use as a length reference, methods for

.ithesizing signals in the optical region,

pid laser-enhanced ionization as a means

pr detecting trace impurities.

intact:

kco Hollberg

I303) 497-5770

imail: hollberg@bldrdoc.gov

Division 847.80

^ulder, Colo. 80303-3328

fTriME TRANSFER AND

»^ETWORK

SYNCHRONIZATION

illST has broad expertise in time transfer,

(•articularly using satellite methods, which

ian be applied to synchronization of widely

tistributed network nodes. Telecommunilations and electrical power networks are (xamples of systems requiring such synchroMzation. A NIST-developed, common-view

flethod using GPS satellites provides time

ransfer accuracy of better than 10 nanoeconds, and two-way exchange of signals

hrough telecommunications satellites

•ffers even higher performance. NIST owns

nd operates a number of specialized GPS

r eivers and satellite Earth stations needed

or such work, and the NIST time scale proides unsurpassed stability' as a reference for

!note synchronization.

0 ntact:

arc A. Weiss

^03) 497-3261

mail: nweiss%ramsey.dnet@clock.bldrdoc.gov

)ivision 847.50

/;ulder, Colo. 80303-3328

PHASE NOISE IN

ELECTRONIC AND

OPTICAL SYSTEMS

NIST has developed systems for making

phase-noise measurements over a broad dynamic range of carrier frequency (into the millimeter range) and Fourier fre- quency (up to 10 percent of the carrier fre- quency). The accuracy of measurement is

typically 1 dB or better depending on the fre- quency range. These systems provide the

basis for specifications now arising in communication, radar, and other aerospace equipment. Signals at higher millimeter and optical frequencies also can be characterized by beating them against a stable

optical reference. A wide range of noise measurement equipment and systems for analyzing the output data are available.

Contact:

Fred L. Walls

(303) 497-3207

email: walls@bldrdoc.gov

Division 847.30

Boulder, Colo. 80303-3328

STATISTICAL ANALYSIS OF

TIME-SERIES DATA

Noise processes in high-performance clocks and oscillators are often not white (fre- quency independent), so the usual variance

does not converge. The two-sample vari- ances developed to handle such noise have become standards widely used in the specification of noise in systems demanding high

spectral purity. These measures also have been applied with some success to other measurement data. NIST researchers have

developed software for the efficient calculation of these measures. Outputs can be

represented in both the frequency and time domains.

Contact:

Fred L. Walls

(303) 497-3207

email: walls@bldrdoc.gov

Division 847.30

Boulder, Colo. 80303-3328

FAR-INFRARED

SPECTROSCOPY

NIST has unique capabilities for highresolution studies of the spectra of atoms and molecules in the far-infrared region.

The methods of tunable far-infrared spec- troscopy and laser magnetic resonance (LMR) were developed by NIST, and several

of each of these spectrometers currently are providing high-resolution measurements on

spectra important in both space studies and

studies of the chemistry of the upper atmosphere. Pressure-broadening studies at high

resolution also have been performed providing the basis for locating (in altitude) important air pollutants. Recent improve- ments in the NIST LMR systems have dramatically improved their sensitivity, making

them especially useful in searches for

difficult-to-detect molecular species, such

as free radicals and molecular ions.

Contact: Kenneth M. Evenson

(303) 497-5129

email: evenson@bldrdoc.gov

Division 847.60

Boulder, Colo. 80303-3328

4
PHYSICS LABORATORY

QUANTUM PHYSICS

Division Contact: David Norcross

(303) 492-6807

email; norcross@micf.nist.gov

fax: (303) 492-5235

JILA*

Boulder, Colo. 80309-0440

LASER STUDIES OF

SEMICONDUCTOR

MATERIALS

Laser probing of the gas-phase species involved in the molecular beam epitaxial

(MBE) growth of III-V semiconductor materials is an area of high potential relevance

for standards and technology. Work under way has demonstrated sensitive, direct-laser detection methods for study of all species

during III-V growth, and it will be extended

to II-VI species. With the incorporation of

non-inv;isive single-photon laser ionization probes into advanced generations of MBE

machines, NIST researchers will be able to carry out in-situ diagnostics to quantify and

characterize the growth process, to provide

optical feedback for adjustment of species

concentrations, and to determine the purities of materials used during semiconductor

fabrication.

In related experimentation, laser vaporization of thin films is used to produce sources

of translationally energetic species for etch- ing and deposition studies. Thermal chlorine molecules produce little or no etching

of silicon materials, whereas etch rates increase dramatically with increasing

kinetic energy, with an apparent threshold. New research will also explore the kinetic energy dependence of film growth by using

* The Joint Institute of Laborator\' Astrophysics (JILA) is a cooperative research venture

of NIST and the University of Colorado.

velocity selected beams of refractory materials and insulators.

Contact: Stephen R. Leone

(303) 492-5128

email: srl@jila.colorado.edu JILA

Boulder, Colo. 80309-0440

LASER STABILIZATION

Many sensitive and sophisticated applications of lasers depend on the laser's spectral coherence, frequency stability, and lowintensity noise. NIST scientists have been working on laser-intensity stabilization,

laser frequency linewidth reduction with

active control techniques, and several methods for producing quantitative laser fre- quency scans. Exciting new possibilities

arise from locking stable lasers to sharp

quantum resonances, provided, for example, by atoms in an "atomic fountain."

Several laser-locking and scanning systems have been developed. One powerful NIST

laser-stabilization system works entirely externally to a continuous-wave laser to suppress the output laser frequency and intensity noise. A precise scanning method is based on optical sideband production by

broadband microwave phase modulation of

the laser, allowing scans over a GHz range, with inaccuracy below 10 kHz. Another scan

technique utilizes a novel interferometer/ phase-locked rf system that effectively maps

optical frequency change into the corre- sponding phase change of an rf signal

suitable for control, stabilization, and scanning. In a final method, a doubly passed

acousto-optic wideband modulator allows scanning the laser relative to a stable refer- ence interferometer.

Contact: John L. Hall

(303) 492-7843

email: jhall@jila.colorado.edu JILA

Boulder, Colo. 80309-0440

SILICON THIN FILMS

Thin films of amorphous silicon are used

in photosensitive devices, displays, and in photovoltaic cells. Scientists are examining'

physical and chemical mechanisms , involved in discharge and thermal chemica

vapor deposition (CVD) production of such

films. A scanning tunneling microscope is used to examine in situ the morphology an. chemical character of as-deposited films. A.

electronics, vacuum, and gas-handling

apparatus necessary for producing and diaj nosing discharge and thermal CVD films - under controlled conditions are available.

Contact: Alan C. Gallagher

(303) 492-7841

JILA

Boulder, Colo. 80309-0440

VISITING FELLOWSHIP

PROGRAM

Since its founding in 1962, JILA has pro- vided an opportunity for established scientists working in various fields of interest to JILA and NIST to spend 6 months to a year

as "Visiting Fellows" working with membt

of the Institute's scientific staff. Approximately 10 of these awards are given each

year. They provide a stipend to the awarder

for partial salary, travel, and laboratory

and/or computational expenses. JILA's broad range of research interests—includ ing atomic, molecular, and chemical phyi

ics, non-linear optics, stabilized lasers, semiconductors, and precision measure- ment (relating to spectroscopy, gravitational physics, and geophysics)

encompasses work of interest to both academic and industrial scientists.

Contact: David Norcross

(303) 492-6807

email: norcross@micf.nist.gov

JILA

Boulder, Colo. 80309-0440
PHYSICS LABORATORY

RESEARCH

FACILITIES

:lSYNCHROTRON

.ULTRAVIOLET RADIATION

;FACILITY II

irhe heart of the NIST Synchrotron Ultrakiolet Radiation Faciht}' II (SURF II) is a iOO-MeV electron storage ring. The synchroI'ron radiation emitted is highly coUimated,

aearly linearly polarized, and of calculable

intensity. Seven beamlines are available,

Uid a users' program is in operation. SURF

jl is well suited for studies in radiometry;

itomic, molecular, biomolecular, and solidjtate physics; surface and materials science;

idectro-optics; and surface chemistry' and

ladiation effects on matter. Special facilities

•ire available for developing and testing soft

f-ray optics and optical devices.

MPABILITIES

rhe t\'pical storage ring electron beam cur- €nt is 200 mA at 284 MeV. The photon

'Intensity in the region 60 nm to 120 nm is

'':J)out 3 X 10^" photons per second per

^nilliradian of orbit for an instrumental

'-esolution of 0.1 nm. Experiments can be

londucted conveniently throughout the

'i/avelength range 4 nm to 1000 nm, from

'he soft X-ray region to the infrared. One

normal incidence, two grazing incidence,

ind several toroidal grating monochroma-

^ors are available to disperse the radiation,

large, ultrahigh vacuum spectrometer caliration chamber, 1.2 m x 1.2 m x 2.5 m

nd accessible through a clean room, is

ivailable for radiometric applications in a

jllean, vacuum environment. A 6.65-m

(

1

normal-incidence vacuum spectrometer, with resolving power of about 100,000, is available on a beamline dedicated to highresolution vacuum ultraviolet radiation

research.

APPLICATIONS The continuous radiation from SURF II is used as a national standard of spectral irra- diance for radiometric applications and for fundamental research in the following

areas:

• atomic and molecular absorption

spectroscopy;

• optical properties of materials;

• electron density of states in solids;

• surface characterization;

• photoelectron spectroscopy;

• molecular kinetics and excitation and

ionization dynamics; and

• radiation interactions with matter (such

as lithography, radiation damage,

dosimetry, photobiology).

AVAILABILITY Beam time on SURF II is available to any

qualified scientist if beamline vacuum

requirements are met and scheduling

arrangements can be made. Proposals should be submitted for NIST review before use of the facility is desired. Informal contact also is encouraged.

Contact: Robert P. Madden

(301) 975-3726

email: rmadden@enh.nist.gov

B119 Radiation Physics Building

HIGH-RESOLUTION UVAND

OPTICAL SPECTROSCOPY

FACILITY

Accurate atomic data for neutral atoms and ions are required in support of hightechnology products and manufacturing

processes as well as advanced scientific

applications. The primary source of such

data is high-resolution optical spectroscopy. Spectrographs produced in NIST's HighResolution UV and Optical Spectroscopy

Facility are the most powerful in the world

for observations of emission and absorption

spectra in the soft X-ray to near infrared

regions. The 10.7-m grazing-incidence and

normal-incidence vacuum spectrographs

permit observations from 3 nm to 600 nm

with resolving powers of 70,000 to 400,000

and wavelength uncertainties as low as 0.0002 nm. In the visible and near-infrared

region, an echelle spectrograph provides

resolving powers exceeding 1,000,000. A

variety of discharge sources are used to

excite spectra of neutral atoms and ions

stripped of up to 20 electrons. Species up to 40 times ionized are observed in plasmas

created by ablating samples with a high- power laser.

Current NIST research includes develop- ment of wavelength standards used for cali- bration of the high-resolution spectrograph on the Hubble Space Telescope, observations

of transitions in highly ionized atoms for plasma diagnostics in tokamaks, develop- ment of a promising new scheme for an

extreme uv laser, and precise isotope shifts

of mercury wavelengths needed to interpret uv spectra of stars.

Contact: William C. Martin

(301) 975-3213

email: ael@tiber.nist.gov AI67 Physics Building
PHYSICS LABORATORY

LOW-BACKGROUND

INFRARED RADIATION

FACILITY

In the NIST Low-Background Infrared Radiation Facility, radiant background

noise levels less than a few nanowatts are attained in a large (60-cm-diameter x

152-cm-long) vacuum chamber by cooling

internal cryoshields to temperatures less than 20 K using a closed-cycle helium

refrigerator system. An absolute cryogenic radiometer (ACR) of the electrical substitution type that operates at 2 K to 4 K is housed in the chamber.

CAPABILITIES The ACR is a broadband detector with a flat response from the visible to the long wavelength infrared spectral region. It can measure power levels of 20 nw to 100 mw at its 3-cm-diameter aperture within an uncertainty of less than 1 percent. The ACR has a

resolution of 1 nanowatt, and its time constant is about 20 s.

APPLICATIONS

This unique facility can be used to measure

total radiant power from sources such as cryogenic blackbodies. Ongoing improve- ments will allow measurement of the spectral distribution of radiation from sources and characterization of infrared detectors and optical components.

AVAILABILITY The facility is operated by NIST staff in support of user infrared calibrations. It is avail- able for collaborative research by NIST and

outside scientists in areas of mutual interest.

Contact: Raju Datla

(301) 975-2131

email: rdatla@micf.nist.gov

B208 Physics Building

ELECTRON PARAMAGNETIC

RESONANCE FACILITY

NIST is leading a national and inter- national effort in electron paramagnetic

resonance (EPR) dosimetry for measuring

ionizing radiation. Paramagnetic centers (molecules/atoms with unpaired electrons)

are produced by the action of radiation on

materials. In the EPR measurement, irradiated materials are placed in a magnetic

field and electron spin transitions are induced by an electromagnetic field of the appropriate frequency (typically GHz). EPR

is used as a non-destructive probe of the

structure and concentration of paramagnetic centers. The centers created by ioniz- ing radiation are proportional to the absorbed dose and provide a sensitive and

versatile measurement method.

CAPABILITIES The EPR dosimetry facility is supported by a

state-of-the-art X-band EPR spectrometer capable of measuring radiation effects on a wide range of materials from inorganic semiconductors to biological tissues. The

recently upgraded data acquisition system

provides full computer control of all spec- trometer functions, including real-time

spectral display and rapid acquisition scan

to analyze rapidly decaying signals. The

data acquisition system is interfaced with an advanced data analysis station for data manipulation and is capable of simulating and deconvoluting multicomponent spectra.

APPLICATIONS EPR dosimetry is operable over several orders of magnitude in absorbed dose

(10" Gy to 10 Gy) and impacts many facets of society and industry. Areas of applica

tion include:

• Radiation Protection/Accident Dosimetr

Using biological tissues (bone, tooth enamel) or inanimate materials (clothing

retrospective dose assessment and mappini

can be accomplished.

• Clinical Radiology. Ionizing radiation

doses administered in cancer therapy can 1 measured for external beam therapy using

dosimeters of crystalline alanine (an amin

acid) or validated for internally delivered bone-seeking radiophanmaceuticals using bone biopsies.

• Industrial Radiation Processing. Routir and transfer dosimetry for industrial radia

tion facilities can be performed using ala- nine dosimeters, as well as post-irradiatioi monitoring of radiation-processed meats,

shellfish, and fruits using bone, shell, or

seed.

The EPR facility also serves as a fully func

tional materials research facility for anah

ing radiation effects on semiconductors,

optical fibers, functional polymers, and

composites.

AVAILABILITY The EPR facility is available for coUabora

tive research by researchers from industr\

academia, and other government agencie: under the supervision of NIST staff.

Contact: Marc F. Desrosiers (301) 975-5639

email: marc@enh.nist.gov

C229 Radiation Physics Building
PHYSICS LABORATORY

IRADIOPHARMACEUTICAL

jSTANDARDIZATiON

jLABORATORY

tRadioactivin- measurements for diagnostic

. and therapeutic nuclear medicine in the

iUnited States are based on measurements at

NIST. Activit)' measurements for the garama-ray-emitting radionuchdes are

rr.ade using the NIST y ionization

::.amber. The cahbration process also

.- eludes identification of radionuclidic

impurities by germanium spectrometry.

- rcent development work has focused on

erapeutic nuclides for nuclear medicine,

iioimmunotherapy, and bone palliation.

CAPABILITIES

"

le radiopharmaceutical standardization

..joratorv' provides calibration services for

the gamma-ray-emitting radionuclides and

!S available for technical users who must

T.ake measurements consistent with

:.itional standards or who require higher

accuracv' calibrations than are available

with commercial standards.

. NIST also undertakes basic research to develop new methods of standardizing

radionuclides for diagnostic and therapeutic applications. These studies include measurements of decay-scheme parameters, such

as half lives and gamma-ray emission probabilities, and identification of radionuclidic

impurities.

AVAILABILITY The customer has no direct use of the

facilit)'. NIST staff can provide calibration

services for the gamma-ray-emitting

radionuclides that comply with the

specifications as stated in NIST Special Publication 250-10.

Working at NIST, research associates of the United States Council for Energy Awareness produce standards that are certified by NIST

as Standard Reference Materials for distribu- tion to the nuclear power and radio pharmaceutical communities.

Contact:

Larry L. Lucas

(301) 975-5546

email: llucas@enh.nist.gov

C114 Radiation Physics Building

MAGNETIC

MICROSTRUCTURE

MEASUREMENT FACILITY

The magnetic microstructure of materials can be measured with ver}' high spatial reso- lution by a technique called scanning elec- tron microscopy with polarization analysis

(SEMPA). An ultrahigh-vacuum electron microscope ha^ been modified so secondary

electrons from the sample can be analyzed

for their electron spin polarization. This

allows for a measurement of the surface magnetism with moments both in the plane

and perpendicular to the plane of the sample.

CAPABILITIES SEMPA allows the simultaneous observation

of surface microstructure and surface magnetic domains at a resolution of 0.05 |J.m.

APPLICATIONS

This unique measurement facility can be

used for research in magnetic thin fihns, high-coercivity magnetic materials, highdensity magnetic storage media, and other advanced magnetic materials.

AVAILABILITY These facilities are available for collaborative research by NIST and outside scientists

in areas of mutual interest on a timeavailable basis.

Contact: John Unguris

(301) 975-3712

email: unguris@epg.nist.gov

B206 Metrology Building
MATERIALS SCIENCE AND

ENGINEERING LABORATORY

Materials science and engineering pro- grams at NIST cover the full range of materials issues from design to processing

to performance. A unifying aim is to acquire the knowledge and tools needed

for intelligent manufacturing methods

with real-time automated process

controls.

Separate research initiatives address ceramics, metals, polymers, composites,

and superconductors. This research supports efforts by U.S. industry to develop

reliable, low-cost manufacturing methods

for producing tailor-made materials and

products with superior properties.

Through laboratory-organized consortia and one-to-one collaborations, NIST's

materials scientists and engineers work

closely with industrial researchers. Examples include work on improved processing

of rapidly solidified metal powders, poly- mer composites, ceramic machining,

aerospace alloys, and non-destructive evaluation sensors for aluminum and

steel manufacturing. The laboratory

is also strengthening its relationships with manufacturers of high-technology

products, the major users of advanced

materials.

Contact:

Lyle H. Schwartz, Director (301) 975-5658

email: schwartz@micf.nist.gov

fax: (301) 926-8349 B309 Materials Building

COOPERATIVE RESEARCH

OPPORTUNITIES

Intelligent Processing of Materials

77 Intelligent Sensors, Controls, and

Process Models

Ceramics

77 Ceramic Processing 77 Surface Properties of Ceramics

78 Electro-Optic Crystals 78 Mechanical Properties of Ceramics 78 Ceramic Phase Equilibria

Materials Reliability

79 Ultrasonic Characterization of Materials 79 Microstructural Engineering 79 Micromechanical Measurements

80 Intelligent Welding

Polymers

80 Processing Science for Polymer

Composites 80 Polymer Mechanics and Structure

81 Dental and Medical Materials

81 Electrical and Optical Properties 82 Polymer Blends 82 Fluorescence Monitoring

Metallurgy

82 Metallurgical Process Control Sensors

83 Corrosion Data Program

83 Corrosion Measurements and

Monitoring 83 Microstructure and Defects in Cast Alloys

83 Performance of Advanced Materials

in Service 83 Magnetic Materials 84 Vapor-Deposited Thin Films 84 Mechanical Properties of Advanced

Materials

Reactor Radiation

84 Neutron Non-Destructive Evaluation 85 Neutron Spectroscopy 85 Small-Angle Neutron Scattering 85 Neutron Diffraction 86 Neutron Reflectometry

RESEARCH FACILITIES

86 NIST Research Reactor

88 Cold Neutron Research Facility

89 Metals Processing Laboratory 90 Polymer Composite Fabrication

Facility 90 Powder Characterization and

Processing Laboratory

91 Cryogenic Materials Laboratory 92 Small-Angle X-Ray Scattering Facility

92 Materials Science X-Ray Beamlines
r

MATERIALS SCIENCE AND ENGINEERING LABORATORY

COOPERATIVE RESEARCH

OPPORTUNITIES

NTELLIGENT PROCESSING

3F MATERIALS

^vision Contact:

il. Thomas Yolken

I3OI) 975-5727

mail: yolken@micf.mst.gov

ax: (301) 869-1718

j344 Materials Building

NTELLIGENT SENSORS,

CONTROLS, AND PROCESS

/lODELS

' anced materials are capable of providing

.:-tanding properties, but they generally

;quire unusual processing operations and

"

i to be expensive. Intelligent processing

;c5 the potential to design and produce

laterials with substantially improved qualreduced lead time, and increased flexiii^ in production.

tclligent processing incorporates four

::icipal elements, including materials

lessors, non-destructive evaluation senthat can measure physical and

-chanical characteristics of materials in

1: time during processing, rigorous mod0 describe the materials production

jcess, and expert systems to control the

oduction process in real time through iniration of sensors and process models.

-Search sponsored by the Office of Intellint Processing of Materials is directed to

jcess models, sensors, and intelligent con1 systems. Research topics at NISI

elude processing modeling, sensing and

)ntrol of the production of metal powders

high-pressure gas atomization, magnetic

lethods for measuring mechanical proper- a during steel processing, process modelig for thermomechanical processing of

steel sheet, process modeling of gas metal

arc welding, ultrasonic measurement of

interfaces, powder-particle-size sensing, process modeling for producing polymer

blends, fluorescence spectroscopy in poly- mers processing, magnetic resonance imaging and ESA for ceramic processing,

eddy-current sensing in metals and composites, and laser ultrasonic methods.

Contact:

H. Thomas Yolken

email: yolken@micf.nist.gov

George Birnbaum

email: bimbaum@micf.nist.gov

(301) 975-5727

B344 Materials Building

CERAMICS

Division Contact: Stephen W. Freiman

(301) 975-6119

email: freiman@micf.nist.gov

fax: (301) 990-8729 A256 Materials Building

CERAMIC PROCESSING

Sintering of ceramics is a complex process

that involves the interaction of many differ- ent processing variables. The influence of

these processing variables on sintering cannot be determined simply by measuring

final density or some other end-point property. Chemical composition of the ceramic powders is known to be of major importance

and, under certain conditions, can mask

effects of most other processing variables. NIST scientists are investigating the effect of

trace levels of impurities using clean-room

processing to produce, compact, and sinter ultrahigh purity ceramics.

Results from this research will enhance

investigations of other processing variables, including particle size, shape, agglomeration, compaction method, and atmosphere under controlled composition conditions. The data can be used to design better models for microstructure evolution during

sintering. Use of predictive models, in conjunction with other ongoing efforts to pro- duce unique compositions and phases, can

lead to new advanced ceramic materials with unique microstructures and properties.

Contact: John E. Blendell (301) 975-5796

email: jblendell@enh.nist.gov A215 Materials Building

SURFACE PROPERTIES OF

CERAMICS

The surface properties of ceramics are crucial for the control of wear, proper lubrication, and efficient machining, all of which are important technological issues. Research conducted at NIST has uncovered

basic wear mechanisms of ceramics under

concentrated sliding conditions. Subsurface damage in the form of dislocations, microcracks, and intergranular fractures often

controls the initiation of the transition to

severe wear. Microstructural design through

innovative sintering aids, processing, and

colloidal chemistry can change the damage

process significantly. Current research

efforts emphasize the identification of critical microstructural features and the develop- ment of microstructures that can release

strain from contact stresses without significantly affecting the strength and fracture toughness of silicon nitrides.

Lubrication prolongs the life of ceramic components in engine applications. Researchers at NIST have explored various

chemistries to uncover new technologies

capable of forming a lubricating film on

ceramic surfaces under boundary lubrication conditions. Several new chemistries have been discovered that are capable of
MATERIALS SCIENCE AND ENGINEERING LABORATORY

controlling friction and wear of ceramic

contacts. This information on surface reactivity of ceramics with various functional groups also may prove to be useful in bearing, gear, and engine component design.

Machining can account for about 50 to 90 percent of the cost of finished ceramic components. Utilization of chemical compounds to form soft layers under the heat and stresses of the machining process not only can reduce the mechanical stresses the work piece is subjected to but also can

improve the surface finish of the work piece.

Initial experiments at NIST have demonstrated the feasibility of the concept; by

using chemical compounds, cutting rates on Si3N4 have been increased by 60 percent with concomitant reduction in surface roughness.

Industrial partnerships to jointly develop

technologies in the above areas are solicited.

Contact: Stephen Hsu

(301) 975-6120

email: hsu@micf.nist.gov A256 Materials Building

ELECTRO-OPTIC CRYSTALS

Imperfections in highly perfect crystals

typically limit their performance in hightechnology applications, such as optical

communications and optical signal processing. In particular, limitations in the perfection of electro-optic and photorefractive

materials, such as lithium niobate and bis- muth silicon oxide, have inhibited the devel- opment of optical switches and modulators.

NIST researchers are investigating crystal

perfection at a unique, monochromatic

X-ray topography facility at the NIST beamlines on the high-energy ring at Brook- haven National Laboratory's National

Synchrotron Light Source in New York. Conducted jointly with growers of high-quality

crystals, current studies are expected to improve substantially the quality, and

hence the performance, of these crystals.

Contact: Bruce W. Steiner (301) 975-5977

email: steiner@tiber.nist.gov A256 Materials Building

MECHANICAL PROPERTIES

OF CERAMICS

Several long-term programs are being con- ducted at NIST on the fracture, creep, and

creep rupture of monolithic and composite

ceramics.

One program involves the use of an indentation strength procedure to determine the

fracture toughness behavior of monolithic

ceramics and to relate the toughness to the

specific microstructure of the material.

In-situ microscopic observations of crack growth demonstrate the presence of grain

bridging and frictional sliding in the crack wake as a significant source of material toughening.

A program in composites is aimed at deter- mining the effects of the fiber/matrix interface on fracture behavior of these materials. Researchers also are investigating the

stresses developed in composites during conventional sintering processes to determine methods of reducing these stresses through

the use of fiber coatings—thus minimizing

or eliminating cracking of the matrix as densification proceeds.

High-temperature deformation and fracture behavior of ceramics are other areas of

research. Creep and creep rupture of several

varieties of Si3N4 have been investigated and their behavior related to differences

in microstructure, particularly grain size.

Facilities exist for performing creep meas- urements in tension, compression, and

flexure at temperatures up to 1800 °C. The

tensile creep apparatus is almost complete!

automated, and measurements are made

using a laser-imaging technique. Displace- ment measurements are accurate to ±l^m at 1500 °C.

Contact: Stephen W. Freiman

(301) 975-6119

email: freiman@micf.nist.gov A256 Materials Building

CERAMIC PHASE

EQUILIBRIA

Ceramic phase equilibria studies at NIST

involve complementary research activities

in experimental, theoretical, data evaluation, and compilation aspects of phase

diagrams. The data evaluation and compi

tion work is carried out under the joint American Ceramic Society/NIST program

provide industry and others with a comprt

hensive database of up-to-date, critically evaluated phase-diagram information. Ceramic phase diagrams also are being determined experimentally and theoreti-

'

cally for systems of technical importance, such as high-transition-temperature ceramic superconductors, and microwave and piezoelectric materials.

Contact: Stephen W. Freiman

(301) 975-6119

email: freiman@micf.nist.gov

A256 Materials Building
MATERIALS SCIENCE AND ENGINEERING LABORATORY 79

IMATERIALS

:;!RELIABILITY

-• pivision Contact:

; Barry I. McHenn'

i303) 497-3268'

femail: mchenr\'@micf.nist.gov

rax: (303) 497-5030

bi\ision 853-00

poulder, Colo. 80303-3328

ULTRASONIC

-CHARACTERIZATION

OF MATERIALS

fo evaluate the qualit\' of advanced mate-

;:i:s, NISI researchers are developing the

.-roretical basis and the measurement techlology for ultrasonic characterization of

naterial properties. Research is under way

n modeling wave propagation, improving

ransduction techniques, developing signal

- - processing methods, and understanding the

• mature of acoustic wave interactions with

naterials.

n modeling, a wavelet formulation has

)een developed that enables the computalonally efficient modeling of acoustic wave

ropagation in composite materials. The

esults are used to optimize measurement

nethods and to interpret waveform

lerturbations.

decent advances in transduction include

lon-contact, gas-coupled transducers and

{'er\- sensitive, high-fidelity sensors for

'icoustic emission. A high-pressure, gasoupled, transmission, acoustic microscope

las been developed for high-resolution

'Itrasonic inspection of electronic packages

itiiout the need for immersion in a liquid.

-eft' signal processing methods include a

aveforai-based interpretation of ultrasonic gnals generated and received by pointontact, broadband transducers, and an

adaptive algorithm for an ultrasonic sensor

array used to image defects in thick composite materials.

Contact: Christopher M. Fortunko

(303) 497-3062

email: fortunko@micf.nist.gov

Division 853.00

Boulder, Colo. 80303-3328

MICROSTRUCTURAL

ENGINEERING

NIST researchers are developing process models and sensors to link the properties

of hot rolled steels to composition and

thermomechanical processing parameters.

Microstructure determines properties, and,

thus, the key to property control is understanding the thermal and microstructural

states of the steel at each processing stage.

Analytical models of plastic deformation during hot rolling, continuous cooling transformation kinetics, and structure

property- relations are used to predict

mechanical properties for a given

temperature/deformation schedule. The

results are experimentally verified in a thermomechanical processing simulator

developed by NIST. The simulator is used to subject specimens to prescribed deformations and to measure the in-process metallurgical changes that occur such as deformation resistance, recrystallization, and phase transformations.

Recently, a program on sensors for microstructural engineering was initiated. The

first task is to develop ultrasonic sensors for on-line measurement of grain size during

hot rolling. The idea is to relate attenuation

measurements to grain size. Facilities are being developed to measure attenuation in

steel samples at temperatures up to 1200 °C.

Contact:

A. Van Clark

email: vclark@micf.nist.gov

Yi-Wen Cheng

email: cheng@bldrdoc.gov

(303) 497-3159

Division 853.00

Boulder, Colo. 80303-3328

MICROMECHANICAL

MEASUREMENTS

The mechanical behavior of materials within electronic interconnect structures controls the reliability of advanced elec- tronic devices. NIST has developed experi- mental techniques to measure thin-film mechanical properties, to map strain fields around interfaces between materials, and to study thermal stresses and map the associ- ated temperature distributions.

Mechanical properties of thin films are measured in an electronic probing station equipped with a loading stage with a resolution of 0.5 mN in load and 2.5 nm in dis- placement. Thin films are prepared using

electronic microfabrication techniques to deposit the film and to etch away the substrate in the test section. A picture-frame concept is used to facilitate handling of the specimens.

Electron-beam moire is a novel technique

to map displacement fields with five times

the resolution of optical moire'. Electron beam lithography is used to create arrays of

lines with pitches down to 100 nm. The

specimens are stressed mechanically or ther- mally inside a scanning electron microscope (SEM). The SEM raster scan serves as the reference grid permitting strain measurements at a magnification of 2000 over gage lengths of 10 |J.m to 30 |J.m.
80 MATERIALS SCIENCE AND ENGINEERING LABORATORY

Differential thermal expansion is the pri- mary cause of stress in electronic devices. NISI researchers use an infrared microscope to measure temperature fields with a

resolution of 30 )im. These measurements

can verify the stress analysis used for device

design.

Contact: David T. Read

(303) 497-3853

email: read@bldr,nist,gov

Division 853.00

Boulder, Colo. 80303-3328

INTELLIGENT WELDING

To improve the reliability of welded joints, NIST researchers are developing sensing and control systems to replace the eyes, ears, and know-how of a skilled welder. Througharc sensing and signal processing tech- niques detect changes in the electrical

characteristics of the arc, A laser vision sys- tem is used to relate these changes to the welding process, i.e., the metal transfer from the electrode to the weld puddle. Process models are being developed to predict

the arc behavior and metal transfer characteristics. The goal is to combine the sensors and process models into an automatic control system.

NIST researchers have developed automated

systems for gas metal arc and flux cored arc welding that can detect contact tube wear, degradation of gas shielding, and mode and

stability of droplet transfer. Through-arc

sensing relies on simple measurements of voltage and current, and thus the welding

torch is free of extra devices.

A typical system consists of electrical sensors, a digital-to-analog converter, signal

conditioners, software, and a personal

computer.

Contact: Thomas A. Siewert

(303) 497-3523

email: siewert@micf.nist.gov

Division 853-00

Boulder, Colo. 80303-3328

POLYMERS

Division Contact:

Leslie E. Smith

(301) 975-6762

email: smith@micf.nist.gov

fax: (301) 869-3239 A309 Polymer Building

PROCESSING SCIENCE

FOR POLYMER COMPOSITES

Fiber-reinforced composites offer, along

with other advantages, versatility in process- ing combined with high strength and stiff- ness at low weight. For the current growth

in the production of these materials to continue, however, more rapid and reliable processing is needed.

NIST researchers are developing new meas- urement tools to characterize the starting materials for composite processing and to study in the laboratory the chemical and

physical changes that occur during processing. The scientific understanding that can

be generated with these tools will facilitate both advances in processing methods and

implementation of on-line control and

automation.

The infiltration of a resin into a fiber pre- form during processing is the critical step in composite fabrication by liquid molding.

Test methods to characterize the resistance

of the preform to resin infiltration have

been developed. NIST is working with several companies, including the Automotive

Composites Consortium (Ford, General

Motors, and Chrysler) , Grumman Corp., and

Boeing, to characterize this resistance in a

variety of materials and use the results in computer simulation models to optimize

the liquid molding process.

In addition, NIST is developing measure- ment techniques to monitor the chemical,

morphological, and molecular changes that occur during processing. The program currently has 10 different spectroscopic, dielectric, thermal, and mechanical techniques

available for process monitoring, and others

are under development. This diversity of

tools provides a unique capability for evalu- ating and calibrating new measurement

methods, for developing process models, and for analyzing model resin systems.

For example, through cooperative projects with NIST, several industries have selected and developed monitoring methods for their particular problems.

Contact: Donald L. Hunston

(301) 975-6837

email: hunston@micf.nist.gov A309 Polymer Building

POLYMER MECHANICS

AND STRUCTURE

Knowledge of the relationships between '

mechanical properties of polymers and poly' mer structure is important to the design anc processing of materials for optimal perform

ance. Researchers at NIST are studying semj

crystalline polymers, polymer glasses, elastomers, molecular composites, and

fibers to develop improved models of mechanical behavior, characterize structun from the atomic- to fine-texture level, and

elucidate relationships between mechanical performance and structure.
MATERIALS SCIENCE AND ENGINEERING LABORATORY

I

II

I

riST scientists use a variet}' of techniques to taracterize the structure of polymers in the pUd state. Nuclear magnetic resonance

;3ectroscopy is used to determine molecular

Tientation, molecular dynamics, and

nicrostructure on the 1-nm to 10-nm scale.

!icrostructural information is deduced

•om C-13 lineshapes obtained with magic

tngle spinning or by proton "spin diffu-

; on" experiments in which domain-size

.iiformation is inferred from the rates at

''hich proton magnetization diffuses in the

jTCsence of magnetization gradients.

1ST scientists are examining the relation-

"tiips beUveen mechanical performance of olymers and fine structures by investigatfig the morphological changes that polyners undergo when they are deformed,

fide- and small-angle X-ray diffraction 5AXS) techniques, which include the use of

osition-sensitive detectors, also are used in

iiese investigations.

1ST scientists use both positron annihilalon spectroscopy (PAS) and SAXS to study

he microstructure of amorphous pohmers.

(AXS and PAS studies complement macrobopic measurements of samples using conentional mechanical testing, as well as a

'mique torsional dilatometer.

mtact:

iregory B. McKenna

601) 975-6770

..jijjmail: greg@micf.nist.gov

'^,•209 Polymer Building

)ENTAL AND MEDICAL

yiATERIALS

I lodem dental and medical materials have

annatically improved the deliver)' of

talth care to the American public. As good

hese materials are, significant problems

temain to be solved.

NIST has a program aimed at helping to solve those problems. This program is devel- oping basic science and engineering that can be used to formulate new materials and

includes transferring that science and technolog)" to industr}', in particular, but not

exclusively, to the dental industry.

The program has the active participation of researchers from the American Dental Association, the National Institute of Dental

Research, dental industries, and universities.

Researchers are working in a number of

areas. For example, a strong effort exists on

understanding the mechanisms of and

improving adhesion of dental biomaterials

to tissues. Also, biodegradable materials are being developed for hard tissue repair and

are being evaluated clinically. Improved

resins that have higher resistance to degra- dation by oral fluids and that reduce polymerization shrinkage are being developed. An in-mouth radiation shield, to

protect cancer patients from secondary' radiation emitted from metallic restorations during radiation therapy, is in clinical trials with industrial sponsorship. The interfaces between fillers and resins of resin-based composite restoratives are being investi- gated with the goal of improving interfacial strength and durability of composite restorations. Work is in progress with the NIST

Metallurgy' Division to develop a metallic, mercury-free restorative that can be used

like dental amalgam.

Test methods are being investigated for

their relevance to clinical failures. Finite- element analyses (FEA) and fractographic

analysis of ceramic dental fixed partial dentures, subjected to an in-vitro test, have

implicated the interface between dissimilar materials as the source for failures, in concert with clinical experience. WeibuU statistical analysis, coupled with FEA, is being

employed for identifying improvements in material systems via risk-of-rupture

analyses.

WeibuU analysis also is being applied to statistical analysis of censored clinical data on

failure of ceramic-metal restorations, to test the hypothesis that this can be a more facile and informative method of analysis than

either Kaplan-Meier or Cox Proportional Hazard analyses of survivability.

Contact: John A. Tesk

(301) 975-6799

email: tesk@micf.nist.gov A143 Polymer Building

ELECTRICAL AND

OPTICAL PROPERTIES

NIST is conducting a number of studies on

the electrical properties of polymers. The

research focuses on dielectric measurements, fundamentals and applications of

piezoelectric and pyroelectric polymers,

monitoring the curing of microelectronic packaging materials, thermal expansion

and thermal conductivity of electronic packaging materials, measurement of space charge distribution within polymer films, and electro-optic properties of polymers.

Scientists have developed instrumentation and data analysis techniques to measure the

dielectric constant and loss of polymer films over a frequency range from 10'^ Hz to 10^ Hz in less than 30 minutes. These devel- opments make it possible to follow changes

in the dielectric spectrum as a function of

time, processing conditions, or other parameters.

The scientists also have designed instrumentation and data analysis techniques to measure the charge or polarization distribution

across the thickness of a polymer film by

analyzing the transient charge response fol- lowing a pulse of energy on one surface of

the film. This technique has been used to

detect the presence of non-uniform electric

fields in the poling of piezoelectric polymers

and to investigate the sign, magnitude, and

distribution of charge injection when poly- mers are subjected to high electric fields.
82 MATERIALS SCIENCE AND ENGINEERING LABORATORY

The facility is referred to as the thermal

pulse facility, and it is available forproprietaiy research.

Organic molecules with highly delocalized 7t-conjugated electrons offer great potential

in the field of non-linear optics due to their

relatively large second-order susceptibilities and their picosecond response times. The

orientation and stability of orientation of polar groups in polymers containing these groups are being investigated by measure- ments of uv-visible spectroscopy, dielectric

relaxation, and space charge or polarization distribution.

Techniques to monitor the degree of cure of

thin polymer films used in microelectronic packaging are being investigated to correlate with their mechanical and electrical

properties. Photoacoustic, fluorescence, and

dielectric spectroscopies are among the methods employed. Instrumentation for measuring thermal expansion coefficients

of thin-film microelectronic packaging

materials is being developed.

Contact:

G. Thomas Davis

(301) 975-672S B320 Polymer Building

POLYMER BLENDS

Blending polymers has become an effective method for producing high-performance

engineering polymers. The fundamental

data required to design a manufacturing

process include the equilibrium phase dia- gram, the energetic interaction parameter

(compatibility) between the blend components, diffusion coefficients, and the

interfacial tension. At NIST, small-angle neutron scattering has been used to measure the interaction parameter and phase dia- gram of polymer blends. NIST scientists have developed forced Rayleigh scattering and temperature- jump light-scattering tech- niques to measure polymer-polymer diffu- sion and other parameters that control phase separation kinetics and morphology.

Shear cells for neutron scattering and light scattering measurements also have been de- veloped and used for in-situ structure characterization and melt processing of shear mixed polymer blends and alloys.

Researchers currently are testing kinetic

theories of phase separation and late-stage coarsening and the control of morphology

and mechanical properties of microphaseseparated polymer blends. As part of this program, they are working with industry to study the homogenization and phase coars- ening of rubber blends.

Contact: Charles C. Han

(301) 975-6771 B210 Polymer Building

FLUORESCENCE

MONITORING

NIST researchers are using fluorescence spectroscopy to characterize structural and dynamic properties of polymers and to monitor the behavior of polymer flows during processing.

Fluorescence quenching is employed, for example, to monitor the uniformity of mixing in polymer blends and in particle-filled polymer melts. Excimer fluorescence is used to monitor the cure of thermoset resins, to detect crystallization and glass transition temperatures, and to measure the temperature of polymers during processing. Fluorescence anisotropy is used to measure

molecular orientation and to monitor the non-Newtonian flows of polymer solutions and melts.

For polymer processing and composites

monitoring, optical fibers are used to trans- mit fluorescence and excitation light energy between the processed polymer and light

source and detection equipment. Well- equipped laboratories containing laser light sources, spectrofluorimeters and a nanosecond spectrofluorimeter are available for carrying out this research.

Contact: Tony Bur

(301) 975-6748 B2 10 Polymer Building

METALLURGY

Division Contact:

E. Neville Pugh

(301) 975-5960

email: pugh@micf.nist.gov

fax: (301) 926-7975 B26l Materials Building

METALLURGICAL PROCESS

CONTROL SENSORS

Special facilities at NIST enable researcher

to develop advanced measurement method: and standards for application in process modeling and control for intelligent proce^ ing of materials. Measurement methods

available include ultrasound, eddy current and acoustic emission. In particular, noncontact ultrasonic facilities featuring high

intensity pulsed lasers and electromagnetic

acoustic transducers have been designed. .

Coupled with state-of-the-art materials- processing equipment and expertise, these

facilities offer a unique opportunity to asct

tain feasibility and develop prototype speci cations for a wide spectrum of sensor need

including the measurement of internal ter

perature, phase transformations, surface- modified layers, porosity, grain size, and

inclusion/segregate distributions.

Contact: George Alers (301) 975-6139 Al67 Materials Building
MATERIALS SCIENCE AND ENGINEERING LABORATORY

CORROSION DATA

PROGRAM

'jtorrosion reduces manufacturing effijienc}', employee safety, consumer safety,

ind consumer confidence or perception of

j[uality. To help U.S. industries avoid the

jiegative impact of corrosion, NISI and the

Rational Association of Corrosion Engineers

4NACE) joined together to form the NACEflST Corrosion Data Program. The objec-

|ive of this program is to use the latest

|d\'ances in information science and techkology to provide industn.- with convenient

Ind reliable information on materials per- Drmance and corrosion control. Working

.ith experts from industr\', NACE-NIST

j jiowledge engineers work to develop expert

j jystems, databases, and modeling programs

Jizt are distributed to industry to help avoid ^/orrosion failures.

j fontact: !ichard E. Ricker

501) 975-6023

;254 Materials Building

CORROSION

yiEASUREMENTS AND

VIONITQRING

'he conrosion of metals in natural and mannade environments is verv' costly to industry

ind government. Researchers at NIST are

•orking to develop improved laboraton' and

ield techniques for measuring and monitorng the chemical reactions that degrade the erformance of materials in service. NIST

riearchers were instrumental in the devel- 'pment of transient and static electrochemial techniques for assessing corrosion

eactions such as potentiodynamic polarizaon, electrochemical noise, ac impedance,

ind in-situ ellipsometry. Also, NIST

fesearchers have developed methods for

I ineasuring the corrosion of metals in field

conditions, such as steel in soil and sea- water, electric utility lines in soil, and of

steel in concrete. Currently, NIST researchers are working on in-situ monitoring of electrochemical conditions and using the information obtained from electrochemical measurements to predict the performance of materials in service.

Contact: Richard E. Ricker

(301) 975-6023 B254 .Materials Building

MICROSTRUCTURE AND

DEFECTS IN CAST ALLOYS

Recent advances in the modeling of metal

solidification are making possible a quantitative understanding of the development of microstructure and the origin of defects in

cast metal parts. NIST researchers are inves- tigating the ways in which knowledge of thermodynamic phase equilibria and of the dynamics of phase transformations can be used to improve the modeling of complex

alloys. Thermophysical properties of these

alloys at elevated temperatures are being

measured to provide a basis for the modeling studies.

Working in collaboration with a consortium

of industries and universities established under the auspices of the Office of Intelli- gent Processing of Materials, NIST workers

are analyzing samples produced in their own laboratories or in the foundries of their collaborators. Such samples are used to test and refine the models so that they can be used more effectively to shorten the design

stage of industrial casting processes.

In addition, advanced sensors are being

developed to monitor the solidification

process.

Contact:

Robert]. Schaefer

(301) 975-6162 A153 Materials Building

PERFORMANCE OF

ADVANCED MATERIALS

IN SERVICE

The performance of materials in service fre- quently deviates from that observed in the research laboratory. This discrepancy is due

primarily to chemical reactions that occur between the service environment and the material. For new advanced materials, the lack of service experience makes critical materials selection and design decisions

difficult and inhibits the acceptance of these materials by industry. NIST scientists are working to assist the development of advanced materials by studying the mechanisms by which service environments influ- ence the performance of these materials. Ultimately, the goal is to develop methods

for measuring, quantifying, and predicting

the performance of any new material in any

application.

Contact: Richard E. Ricker

(301) 975-6023 B254 Materials Building

MAGNETIC MATERIALS

As part of the NIST program in magnetic

materials, researchers are studying the magnetic properties of alloys and their rela- tionship to metallurgical structure. Nanocomposites, composition-modulated alloys, high-temperature superconductors, metallic

glasses, and icosahedral crystals are among

the materials being investigated. Hysteresis, Barkhausen effect, and other magnetic properties of materials are being investigated

through computer modeling. Magnetic properties are characterized by ac and dc (vector VSM and SQUID), magnetic susceptibility measurements, magnetocaloric properties, Barkhausen effect, magneto-optic Kerr

effect, flux distribution imaging, ferro-
84 MATERIALS SCIENCE AND ENGINEERING LABORATORY

magnetic resonance, and Mossbauer effect

observations. Magnetic standards are being

developed. Applications include magnetic

refrigeration, intelligent processing of

materials, information storage, and

non-destructive evaluation.

Contact: Lawrence H. Bennett

(301) 975-5966

email: larry@enh.nist.gov Bl 52 Materials Building

VAPOR-DEPOSITED

THIN FILMS

Obtaining new fundamental understanding

of the detailed physics and chemistry of thin-film formation from high-temperature vapor sources is an objective of NISI researchers. This effort is currently developing

a laser-produced vapor deposition facility, with measurement access for a variety of

existing vapor diagnostics facilities.

These in-situ facilities include highpressure sampling molecular beam mass

spectrometry, optical multichannel emission spectroscopy, laser-induced fluores- cence spectroscopy, and optogalvanic effect

spectroscopy. These diagnostic techniques

provide time- resolved, species-specific gas- phase compositions during the gas transport

process.

In addition, film characterization facilities, including magneto-optical Kerr effect, SEM

and TEM-based X-ray analysis, and Auger/

ESCA are available. Current plans are to extend measurements on film-producing

environments to conventional sputtering conditions as well. Films of current interest include electronic, magnetic, and high Tc

materials.

Contact: John W. Hastie (301) 975-5754 B106 Materials Building

MECHANICAL PROPERTIES

OF ADVANCED MATERIALS

Reliable databases of the mechanical properties of advanced materials, such as inter- metallics and metal-matrix composites, are needed to facilitate their exploitation in

industrial applications. Materials scientists and engineers at NIST are developing the

specialized mechanical test methods and measurement techniques needed to evaluate

the properties of these materials, which

often exhibit anisotropy, inhomogeneity,

ver}' low ductility, or other characteristics

that negate the use of conventional test methods.

Extensive facilities are available for this work. These include a wide range of testing

equipment with associated instrumentation

for tensile, compressive, and torsional tests, and also for combined load and fracture

tests under a variety of simulated service environments. In addition, separate laboratories are devoted to fatigue, creep, impact,

and hardness testing. The staff has extensive experience in all of these areas as well as in

related fields such as failure analysis, analytical fracture mechanics, stress analysis, and the modeling of mechanical processes.

Examples of recent and current activities in

these areas include mechanical property measurements from the microscale (e.g.,

electronic solder connecfions) to multimillion pound-force scales (e.g., fracture toughness of heavy section steels) and studies of the fatigue properties of metal-matrix

composites and the residual stresses in

welds.

Contact: Leonard Mordfin

(301) 975-6168 B144 Materials Building

REACTOR RADIATION

Division Contact:

J. Michael Rowe

(301) 975-6210

email: rowe@micf.nist.gov

fax: (301) 869-4770 A106 Reactor Building

NEUTRON

NON-DESTRUCTIVE

EVALUATION

Neutron radiography has been a wellestablished tool for non-destructive evaluafion (NDE) for some time. More recent neutron applications in NDE include neutron diffraction for texture and residual

stress determination. All three of these

specialties are available for cooperafive

research and development at the NIST reac

tor. In general, these techniques parallel

their X-ray counterparts; however, in certai

cases (such as where hydrogenous components are critical, or subsurface texture or

residual stress distributions are sought)

X-rays do not provide the needed sensitivity

or penetration.

NIST and Department of Defense (DOD)

scientists are continuing a cooperative

project to develop and apply neutron diffrc

tion to texture and residual stress characterization. Texture studies have centered o

copper, tantalum, and uranium-alloy coo" ponents for a variety of DOD end items;

recent work has included ceramic super- conductors. Neutron residual stress studies have focused on components made of the above metals, ceramics, fiber-reinforced ceramic composites, and steel—includins weldments.

NIST scientists are collaborating with scie

tists from the Smithsonian Institution to continue the examination of art works by
MATERIALS SCIENCE AND ENGINEERING LABORATORY

Seutron autoradiography. The technique

Iso has been appUed to industry-related

problems, and efforts are being made to

Jextend its capabilities to cold neutron

iautoradiography.

kk)ntact:

Penr\'J. Prask pQl) 975-6226

)email: hank@micf.nist.gov - iA106 Reactor Building

INEUTRON SPECTROSCOPY

The vibrational dynamics and diffusion of hvdrogen in metals and molecular species

in heterogeneous catalysts, clays, and other

lavered materials are studied at NISI with

r.elastic and quasi-elastic neutron scatter-

.." g. The results of this research reveal the bonding states and atomic-scale interactions and diffusion paths in such materials. Recent progress has allowed in-situ spectroscopic studies of hydrogen and molecular

species down to 0.1 of an atomic percent.

These measurements can provide direct

information, for example, on the molecular

processes that affect reaction and selective

release of chemicals in industrial catalysts and on the local trapping and clustering of hydrogen in metals and semiconductors,

which cause embrittlement, corrosion, or changes in electronic properties. Collaborations with researchers from outside laboratories also include studies of the dynamics of

atonis and molecules in fullerenes and

other molecular solids, alloys, and zeolites.

For the above research, the equipment available includes three-axis neutron crystal

spectrometers and time-of-flight spectrometers for inelastic scattering, which, along

with neutron diffractometers, measure structural and dynamic processes in the time

regime from 10''°s to 10''''s. Controlled

temperature (0.3 K to 1300 K) and pressure

devices are available for changing sample

environments.

Contact:

J. Michael Rowe

(301) 975-6210

email: rowe@micf.nist.gov

John J. Rush

(301) 975-6231

El 51 Reactor Building

SMALL-ANGLE NEUTRON

SCAHERING

Small-angle neutron scattering (SANS) is used to characterize submicron structural and magnetic properties of materials in the

size regime from 1 nm to 500 nra. The SANS

diffraction patterns produced by structural

features in this size regime—for example,

by small precipitates or cavities in metal

alloys, by micropores or cracks in ceramics,

by colloidal suspensions and microemulsions, or by polymers and biological macromolecules—can be analyzed to give information on the size and shape of the

scattering centers as well as their size distri- bution, surface area, and number density. This detailed microstructure information

is often a key to the prediction or understanding of the performance or failure modes of structural materials and materials processing conditions.

A number of scientists from the chemical,

communications, advanced materials, and

aerospace industries already are engaged in SANS research at NIST.

Three SANS instruments are available in the NIST Cold Neutron Research Facility, which

is described on page 88.

Contact:

Charles]. Glinka

(301) 975-6242

email: glinka@enh.nist.gov E151 Reactor Building

NEUTRON DIFFRACTION

Precise information on crystal structures in

solids is often a key to understanding or improving the properties of modern materials and creating new materials with specific properties. Many important materials,

for example, fullerenes, ceramics, catalysts, and rapidly solidified alloys, often can be obtained only in powdered form. In addition to single-crystal diffraction, state-ofthe-art capabilities are available at NIST for measuring and analyzing the crystal and

magnetic structure of polycrystalline materials by neutron diffraction. Both singlecrystal and multidetector, high-resolution

powder diffractometers are available.

NIST researchers continue to develop

improved methods for accurate structure refinement. A major effort is under way in

relating atomic arrangement, including

defects, to superconducting properties in high Tc ceramic superconductors. In addition, a number of industrial scientists are collaborating with NIST staff in neutron diffraction studies of inorganic catalysts, new

kinds of ionic conductors for small batteries and fuel cells, improved ceramics for microcircuit substrates and engine components,

and high-performance lightweight alloys

for advanced aircraft.

Contact: Edward Prince

(301) 975-6230

email: prince@enh.nist.gov Antonio Santoro

(301) 975-6232

E151 Reactor Building
MATERIALS SCIENCE AND ENGINEERING LABORATORY

NEUTRON REFLECTOMETRY

The importance of thin films, layer structures, and interfaces has grown significantly

in the last few years in a number of applications areas. Analogous to electromagnetic

radiation, neutrons can undergo specular

reflection at surfaces. Because neutrons can

distinguish between different isotopes of the same element (such as hydrogen and

deuterium), can penetrate to focus on subsurface interfaces, and are sensitive to magnetic properties of materials, they provide an important complement to other surface

probes.

Thermal neutron reflectometry and grazingangle diffraction are currently available at the NIST reactor. For the former, reflectivities as low as 2 X 10'^ have been measured,

which is competitive with any neutron

reflectometer in the world. An even more

sensitive instrument is now operational in

the NIST Cold Neutron Research Facility. Reflectometry studies at NIST and elsewhere

include superconducting and magnetic layers, magnetic multilayers, polymer interfaces, and solid-liquid interfaces.

Neutron grazing-angle diffraction—first demonstrated at NIST—is a very new tech- nique. With this approach, lattice spacings

of planes with normals parallel to the sample surface are determined to depths

of ~ 10 nm.

Co7itact: Charles F. Majkrzak

(301) 975-5251

email: majkrzak@enh.nist.gov E151 Reactor Building

RESEARCH

FACILITIES

NIST RESEARCH REACTOR

The NIST research reactor is a national

center for the application of reactor radiation to a variety of problems of national

concern. A wide variety of internal and exter- nal programs have benefited from the broad

range of capabilities available to researchers from industry, universities, and govern- ment laboratories.

CAPABILITIES The NIST reactor is an enriched-uranium,

D2O cooled and moderated reactor, with

a peak thermal core flux of 4 x 10^^

neutrons/cm^-s. The core comprises 30 fuel elements of a unique, split-core design, in which nine radial beam tubes look at a 17-cm gap between fuel-element halves. A

large-volume cold source, two tangential

and one vertical beam tube, a thermal col- umn, several vertical thimbles, and four

"rabbit" tubes complete the configuration.

The reactor operates continuously, 24 hours

a day on monthly cycles, followed by

approximately a week of shutdown for refueling and maintenance.

The reactor utilizes the flux available in a

very efficient manner through relatively

short core-to-instrument distances and

large-diameter beam tubes. As a result, the

flux on the sample for certain instruments

is comparable to that at other major

research reactors of higher power and

peak core flux.

The experimental facilities in the reactor

hall are used for neutron scattering and diffraction, neutron radiography, trace analysis and depth profiling, neutron dosimetry

and standards development, irradiations, and isotope production.

Sample environments for low and high temperature, low and high pressure, and high . magnetic fields are routinely available. 1 On-line graphics, plotting, and data fitting t

are available via personal computers,

'

Macintoshes, Micro-VAXs, and a DEC 5810. i,

• Elastic Scattering. Three beam ports are dedicated to elastic scattering studies. A new

high-resolution powder diffractometer is

installed at beam tube 1 (BT-1). It is a

32-detector instrument that provides three monochromator positions, each set at 0.154-nm wavelength but at different takeoff angles to allow maximum flexibility in

selecting the optimal resolution function foi

a given measurement. Collimations down tc 7'-20'-7' are available.

A triple-axis spectrometer with a four-circle goniometer is installed at BT-6 and is used

primarily for residual stress and texture measurements, although inelastic scatter- ing experiments also can be performed. Thi

spectrometer is typically operated in the ela:

tic scattering mode without an analyzer for

texture studies and with the analyzer for

residual stress measurements. Incident ener

gies are continuously variable with 2 0m's from 20' to 75' available. Beam sizes up to 30 X 50 mm^ and down to 2 x 2 mm^ (for

residual stress studies) are utilized. Singlecrystal structure determinations are per- formed on this instrument while a new

residual stress/texture/single-crystal diffrac tometer is being completed on BT-8.

A new thermal-neutron reflectometer, in which the incident beam can be polarized and the spin state of the reflected beam an:

lyzed, is operational on BT-7. In this reflec

tometer, a pyrolytic graphite (PG) filtered beam is incident on the vertically focusing

PG monochromator set for a principal wav

length of 0.235 nm. For collimations of
MATERIALS SCIENCE AND ENGINEERING LABORATORY

- - r preceding and 1' following the raonophromator, respectively, the wavelength resolution 51/1- 0.01, and the actual flux on

hhe sample is ~ 5 x 10' neutrons/cm"-s.

(Two %e detectors are incorporated: one for

retlectivit}' measurements; the other for pazing-angle-diffraction experiments.

-Polarization of the incident beam is accomplished in transmission by one or more

polarizing Fe-Si supermirrors deposited on

l5ingle-cr\'Stal Si substrates. Reflectivities

' iown to about 2 x 10' with a signal-to-

. ise ratio of about 1 have been measured.

• Inelastic Scattering. Three triple-axis

' -lastic scattering spectrometers are

f erational. The BT-4 instrument employs

:.vo remotely selectable, vertical-focusing Tionochromator crv'Stals (pyrohlic graphite

arid Cu), which provide incident energies

Tom 3 meV to 300 meV continuously. It is

.loable of elastic-peak resolution down to

j.u4 meV and also can be used in the

inverted-filter mode for energy-loss

-ctroscopy of vibrations in the 15-meV

.0 280-meV range. The BT-9 spectrometer

ifkis variable incident energy in the 5-meV to 50-raeV range and coUimations

iowntol0'-12'-12'-l6'.

The BT-2 instrument has both triple- axis and polarized-beam (up to 96 percent)

capabilities. Either a pyrolytic graphite or a

^Hjsler-alloy monochromator, each verti-

.aily focused, are available, with remotely

insertable cold berv'llium or pyrolytic graphite filters. Built-in guide fields and spin rota-

'ors and collimation as low as 10'-5'-5'-20'

rt available.

• Elemental Analysis. Neutron activation

analysis is performed utilizing the clean oom for sample preparation, the reactor

rradiation facilities, semi-hot and warm

radiochemistry labs, and state-of-the-art radiation-counting labs. Development

of methodology has aimed at accuracies

and sensitivities over concentrations of

10'^" percent to 100 percent.

Radiochemical separations for specific ele- ments and multielement analysis at the

ultratrace level are available. A thermal

neutron-capture prompt-gamma activation

analysis facility is operational, with a neuQ 9 tron fluence of 5 x 10 n/cm^-s in a 2-cmdiameter beam.

A thermal neutron-depth-profiling facility is

installed on BT-3 for non-destructive deter- mination of near-surface elemental depth

distributions in a variety of materials. Sensitivities approaching 10^^ atoms/cm" with a

spatial resolution of better than 30 nm for depths of 5 mm to 20 mm are achievable.

• Neutron Standards and Dosimetry. A number of neutron fields for standards and

dosimetry are available. These include a

Cf fission source, a ^^^U cavity fission

source, the thermal column beam, an inter- mediate energy standard neutron field, and

2-, 24.5-, and 144-keV filtered beams.

• Irradiation Facilities. Four pneumatic

tubes for 40-cm^ rabbits with fluence ranges

of 3 X 10^ 4o 2 X 10^'^ n/cm^-s for irradiations of seconds up to hours are available. The cadmium ratio range for these facilities

is 4 to 3000 (Au). For long irradiations 6-cm- and 9-cm-diameter in-core thimbles

are used. These are D2O filled with fluences

of 2-4 X 10^^ n/cm^-s.

• Neutron Radiography. Radiography

facilities are available at a highly thermalized beam of the thermal column. Fluences range from 10 to 10 n/cm -s, depending on resolution, with a Cd ratio of 500:1 and

an L/D ratio adjustable from 20:1 to 500:1. The beam is 25 cm in diameter at the image plane 2 m from the reactor face.

Facilities for autoradiography also have been developed.
MATERIALS SCIENCE AND ENGINEERING LABORATORY

APPLICATIONS Many of the principal applications have been described elsewhere in this report. Others include:

• Structural and Spectroscopic Studies of Magnetic Materials. Recent efforts have

focused on rare-earth compounds, amorphous magnets and spin glasses, super- conductors, magnetic bilayers, and

hydrogen in metals.

• Elemental Analysis Programs. Examples

include studies in environmental chemistry,

nutrition, biomedicine, energy and elec- tronic devices—with emphasis on Standard

Reference Materials for these applications.

• Neutron Dosimetiy Studies. Specific projects include neutron fluence standards for power reactor pressure vessel irradiation surveillance, ultralight mass assay for commercial track recorder detectors, absolute

fission-rate measurements, and develop- ment of thermal neutron beam monitors.

AVAILABILITY There are 25 thermal neutron facilities at the reactor, which provide about 125,000 instrument hours per year. In 1992, over 700 researchers from 14 NIST divisions, 28

other government organizations, 1 14 U.S. industrial and university laboratories, and

65 foreign laboratories utilized the facilities, either collaboratively with NIST staff or independently.

Contact:

J. Michael Rowe

(301) 975-6210

email: rowe@micf.nist.gov A106 Reactor Building

COLD NEUTRON RESEARCH

FACILITY

The NIST Cold Neutron Research Facility (CNRF) is the first in the United States devoted exclusively to cold neutron

research. The facility provides U.S. researchers prime access to a key tool of modern

materials science. When fully complete in 1994, the $30 million project will provide

15 new experimental stations for use by U.S. researchers, with capabilities currently unavailable in this country.

The facility is focused on the cold source, a block of D2O ice (with 8 percent H2O added)

cooled to -40 K by recirculating helium

gas. The cold source is viewed by one port

inside the reactor hall and seven neutron

guide tubes. The guide hall and associated

office and laboratory space has more than

tripled the workspace available at NIST for neutron beam researchers.

CAPABILITIES Instruments currently in operation include:

• Small-Angle Neutron Scattering (SANS).

The NIST/Exxon/University of Minnesota and the NSF/NIST Center for High Resolution Neutron Scattering (CHRNS) 30-meter SANS instruments combine long flight paths and variable collimation to provide flexibility, angular resolution, and beam intensities that compare favorably with any SANS

instruments in the world. Large-area

position-sensitive detectors provide exceptional sensitivity to materials structures ranging from roughly 1 nm to 500 nm. An 8-m SANS instrument also is available. Computer-automated equipment is available for maintaining samples at temperatures from

4 K to 700 K and in magnetic fields up to 20 kilogauss. To extract structural information from the data, the researchers analyze SANS patterns with an interactive color graphics system and related programs.

Polarized neutron capabilities are planned

for both 30-m instruments.

• Depth-Profiling Instrument. With a measured chemical sensitivity 20 times that of the existing NIST thermal-beam instru- ment, this station features automated sample handling, near real-time spectral processing, goniometer positioning of sample and detectors, and sample temperature

control. Increased signal intensity will per- mit multidimensional imaging of elemental distributions and profiling of nuclides with absorption cross-sections for charged

particle emission of less than 1 barn.

• Prompt-Gamma-Ray Activation Analysis.

Providing much greater sensitivity for this method than any existing thermal-beam

instrument in the world, this equipment provides unique measurements of chemical ele- ments, such as hydrogen (detection limit <2 jig), that are difficult to detect by other means.

• Medium Resolution Time-of-Flight

Spectrometer. The energy resolution of this instrument, 40 to 6OO jieV, is suitable for a broad range of studies of diffusional motions and magnetic and vibrational excitations. A combination of double-crystal

monochromator and Fermi chopper, with a

detector array covering a large range of scat- tering angles, allows incident energies from

2.2 to 15.5 meV and (elastic) momentum

transfers from 1.0 to 49 nm"\

• NIST/IBM/University of Minnesota Cold Neutron Reflectometer. This instrument is expected to exceed the sensitivity of the ther- mal instrument—already among the best

in the world. In addition, the CNRF reflec- tometer incorporates vertical scatteringplane geometry and a horizontal sample

plane that allows examination of liquid

surfaces. Independent movement of sample and detector allows measurement of off- specular scattering. A grazing-angle diffraction capability will be added in the future.

• Fundamental Physics Station. Available

for use only in collaboration with the NIST

fundamental physics research group, an end

guide position physics station currently is instrumented for a new measurement of the
MATERIALS SCIENCE AND ENGINEERING LABORATORY

INTERFEROMETER

30-METER SANS

ifetime of the neutron. A second fundamen-

;al neutron physics station, a neutron interferometer, is also operational.

» A neutron optical bench is available for

;esting and calibrating neutron devices such

as focusing capillary tubes.

» A cold neutron triple- axis spectrometer is operational.

Instruments planned for completion by

:he end of 1994 include a spin-polarized

nelastic neutron spectrometer, a highresolution time-of-flight spectrometer, a

oack-reflection spectrometer, and a spinecho spectrometer.

APPLICATIONS The unusual sensitivity' and range of measirements possible at the NISI CNRF provide

ipplications in materials structures, materials dynamics, chemical analysis, and

|>ieutron physics. Currently operational

instruments are used to study microstrucmres in metals, ceramics, and colloidal mixtures; thin films, layered structures, and

fnterfacial properties; magnetic properties and shear-induced phenomena; molecular

.geometry of polymer and biological macroTiolecules; chemical composition of

semiconductors, high-tech materials, air- pollution filters, and other samples; and

neutron decay rates.

AVAILABILITY The CNRF operates as a national facility open to all qualified researchers. NISI

develops experimental stations for use by

the general U.S. research community. Twothirds of the available time on these stations

(three-fourths on CHRNS instruments) will be allocated by a Program Advisory Committee (PAC) on the basis of scientific merit of

written proposals. The second mode involves Participating Research Teams (PRTs),

which are developing the remaining stations. The PRTs are responsible for design,

construction, and maintenance of the facilities in return for three-fourths of the available time. The remaining time will be

allocated by the PAC. For all instrumental

stations, instrument-responsible scientists

will be designated to assist users in performing their experiments.

Contact:

J. Michael Rowe

(301) 975-6210

email; rowe@micf.nist.gov AI06 Reactor Building

METALS PROCESSING

LABORATORY

The metals processing laboratory at NIST

contains special facilities for the production

of rapidly solidified alloys, including equip- ment for gas atomization and electrohydrodynamic atomization to produce rapidly

solidified alloy powders, melt spinning to produce rapidly solidified alloy ribbons, and electron beam surface melting to pro- duce rapidly solidified surface layers. Hot

isostatic pressing equipment is available for consolidating alloy powders.

CAPABILITIES

• Gas Atomization. The gas atomization

system can be used to produce up to 25 kg

of rapidly solidified alloy powder per batch

while maintaining a controlled atmosphere

throughout the atomizing and powder handling process. High-energy gas (Ar or N)

impinging on a liquid metal stream breaks up the liquid into small droplets, which

solidify rapidly. Cooling rates are up to 10^ K/s. The atomized powder, entrained

in the gas flow, is collected in removable,

vacuum-tight canisters. This facility can be

used for proprietary research.
90 MATERIALS SCIENCE AND ENGINEERING LABORATORY

• Electrohydrodynamic Atomization. In the electrohydrodynamic atomization system, a

liquid metal stream is injected into a strong

electric field. The field causes the stream to disintegrate into droplets, which solidify rapidly to produce extremely fine (<1 |im

diameter) alloy powder. Powder produced

by this process is well-suited for studying

solidification dynamics. As the system is presently configured, small quantities for microscopic examination can be produced from alloys with melting points up to 900 °C.

• Melt Spinning. Melt-spinning techniques can be used to produce rapidly .solidified

alloys in ribbon form. Because of the high

cooling rates (up to 10^ K/s) with this method, amorphous alloys as well as crystalline alloys can be produced. Ribbons up to 3-mm wide and 0.05-mm thick can be pro- duced in quantities of several grams per

batch. Materials with a wide range of melting points, from aluminum alloys to superalloys, have been produced.

• Electron-Beam Surface Melting, An

electron-beam system, which provides sur- face melting and subsequent rapid resolidifi- cation of surface layers, can be operated in either a pulsed or continuous mode. The

electron beam can be focused to a spot less than 1 mm in diameter and deflected at fre- quencies up to 5 kHz.

• Hot Isostatic Press. A hot isostatic press (HIP) with microprocessor control of the temperature-pressure-time cycle is available

for consolidation of powder or compacted

powder shapes. The HIP has a cylindrical

working volume 15 cm in diameter and

30-cm high. The maximum working pres- sure is 207 MPa. The molybdenum furnace has a maximum heating rate of 35 K/min

and is capable of maintaining 1500 °C.

AVAILABILITY These facilities are designed to produce

alloy research samples that otherwise are

difficult for users to obtain. Typically, industrial companies or universities send workers

to NIST to participate in preparing alloys of

special industrial and scientific interest for further analyses in their home laboratories and to collaborate with NIST scientists in

inve.stigations of generic relationships between processing conditions and resulting

alloy microstructures and properties.

Contact: John R. Manning

(301) 975-6157 A153 Materials Building

POLYMER COMPOSITE

FABRICATION FACILITY

The composite fabrication facility permits

the preparation of well-controlled polymer

composite samples for scientific studies and

the evaluation of results from NIST's processing science program in a realistic fabrication environment.

CAPABILITIES The facility involves five major components

and associated support equipment: a prepregger to prepare sheets (up to 180 cm X 30 cm) of unidirectional fiber coated with

resin; a fully computerized autoclave capable of temperatures up to 430 °C and

pressures up to 2.1 MPa; an automated

hydraulic press (temperatures up to 535 °C)

with water-cooled platens for rapid, controlled cooling; a unidirectional flow facility for characterizing the permeability of

fiber preforms in all three directions; and a

specially designed two-component pumping

system for fabrication of samples by resin transfer molding and for conducting flow

visualization experiments.

APPLICATIONS The facility can be used to study a variety of questions, such as the details of resin flow and void formation during processing and

the influence of processing conditions, fiber orientation, and fiber-surface treatments on

performance.

AVAILABILITY Used by NIST staff in an active research pro- gram on polymer composites, the facility is available for collaborative studies with

industry, academic institutions, and other government agencies.

Contact: Donald L. Hunston

(301) 975-6837 A309 Polymer Building

POWDER

CHARACTERIZATION

AND PROCESSING

LABORATORY

Advanced ceramics are manufactured by the consolidation of fine powders. Researchers

at NIST are working to develop the scientific foundation needed for improving reproducibility and reducing the cost of producing

ceramic components. The powder characterization facility offers specialized instru- mentation for measuring physical

properties, phase composition, and surface chemical properties. In addition, facilities

exist for processing and synthesizing

ultrapure powders.

CAPABILITIES

• Physical Properties Measurement.

Particle-size distribution, specific surface

area, specific gravity, and porosity are somt

of the major physical properties for which

instrumentation is available. Powder-size

distribution can be determined by gravity sedimentation followed by X-ray absorptiot

centrifugal sedimentation, light diffraction and photon correlation spectroscopy.
MATERIALS SCIENCE AND ENGINEERING LABORATORY

I The size range of these instruments covers

I 0.03 M-m to 200 [im. Each instrument

I works in a specific range and provides the

i data in the form of a discrete size range.

I The particles are examined directly by the

j application of scanning and transmission

I electron microscopy of particles as small as

i 0.001 ^im.

I • Surface and Interface Chemistry MeasureI ments. The surface and interface characj terization of powders contributes to the

! knowledge base of the surface interactions

I of particles in contact with solvents. As the

I particles become smaller, their surface

1 characteristics become more significant.

I MicroRaman and Fourier transform infraj red spectroscopy are used to study surface

i composition, and electrophoretic mobilit}' and acoustophoretic mobility are used to

I study modification to the powder surface as

' a result of an interaction with a solvent.

• Phase Composition. Since most of the ceramic powders undergo phase transformation during densification, understanding

the phase changes in specific densification environments is an active part of NIST

research. The Siemens high-temperature

.X-ray diffractometer has a temperature

range from room temperature to 3000 K

and a position sensitive detector. In addition, sintering can be carried out in oxygenfree argon or nitrogen environments.

• Solid-State Imaging. The solid-state nuclear magnetic resonance (NMR)

spectrometer/imager carries out measurements in chemical shift, nuclear spin densit)', relaxation times, and imaging of NMR

active nuclear distribution. Ceramic powder

slurries, green bodies, and dense ceramics

can be analyzed for identification of impurities, chemical state, and composition distri- bution by non-destructive evaluation. In

addition, the NMR can determine amorphous phase content of the powders.

• Powder Synthesis. The ability to synthesize powders of controlled characteristics is necessary for development of a powderprocessing knowledge base. The fine-powder

synthesis facility consists of a chemical flow

reactor for controlled synthesis and inert atmosphere chambers. A solution atomizer

is available to generate polydisperse aerosols in the range 0.01 |im to I.O jim, as is a spray dryer to form monodisperse agglomerates in the range 0.5 [im to 100 |im.

• Colloidal Suspensions Preparation. Colloidal processing of ceramic powders has emerged as an attractive technology for pro- ducing defect-free ceramics. However, some

major issues still remain to be addressed, including the lack of characterization techniques for slurries that contain high

concentrations of solids and scientific understanding of limitations in the preparation

of such slurries. The powder processing

laboratory consists of an acoustophoresis

instrument, a rheometer, a high-energy agitation ball mill, and slurry consolidation equipment. These techniques are used to study interface chemistry, flow behavior,

size reduction, morphology modification,

and densification of polydisperse particles and similar processes resulting from interactions between the particles and their environment.

AVAILABILITY These facilities are used primarily to support NIST research programs using ceramic

powders. They are available for coUaboraative or independent work by qualified gov- ernment, industry, or university personnel

with preference given to projects related to ceramics research.

Contact: Subhas G. Malghan

(301) 975-6101

email: malghan@enh.nist.gov

A256 Materials Building

CRYOGENIC MATERIALS

LABORATORY

NIST has the nation's leading facilities for the evaluation of the mechanical, physical,

and thermal properties of materials at low

temperatures, particularly for liquid helium

(4 K) and liquid oxygen (90 K). These facilities are used routinely by industry and other government agencies to characterize materials for superconducting magnets, aero- space propulsion systems, and energy

storage and transportation equipment.

CAPABILITIES A wide range of mechanical properties can

be measured at cryogenic temperatures, including tension, compression, torsion,

shear, fatigue, creep, and fracture toughness. Eight test machines with maximum

load capacities ranging from 4 KN to 5000 KN are equipped with cryostats and

fixtures for the various tests.

Elastic constants and related physical properties are measured over the temperature range 295 K to 4 K. Thermodynamics links

elastic constants with specific heat, thermal

expansivity, atomic volume, and the Debye

temperature. Related studies are conducted

in an X-ray diffraction unit equipped with a cryogenic stage. Other physical property measurement capabilities include magnetic

susceptibility and thermal properties.

Thermal property measurement capabilities include thermal expansion and thermal

conductivity. For insulating materials, ther- mal conductivity is measured in guarded

hot plate (GHP) apparatus; the laboratory has four GHPs with measurement capabilities ranging from 4 K to 1200 K. A fixedpoint compression probe is used for conducting materials such as metals.

Several unique facilities are available for oxygen compatibility studies. Friction and

wear studies are conducted on bearing materials for liquid oxygen pumps in a ball-ondisk tribometer capable of operating in

liquid and gaseous oxygen environments. A

high-pressure/high-temperature differential
MATERIALS SCIENCE AND ENGINEERING LABORATORY

thermal analysis apparatus is used to study

the oxidation of metals in liquid-oxygen

propulsion systems.

AVAILABILITY These facilities are available to guest

researchers for collaborative programs. NISI routinely performs research and measurement services for outside sponsors.

Contact:

Larry L. Sparks

(303) 497-3612

email: sparks@micf.nist.gov

Division 853.00

Boulder, Colo. 80303-3328

SMALL-ANGLE X-RAY

SCAHERING FACILITY

Small-angle X-ray scattering (SAXS) is a technique in which a highly collimated beam of X-rays (wavelength range 0.07 nm

to 0.3 nm) is used to probe the structure of materials on the size scale of 0. 1 nm to 100 nm.

Materials exhibiting structure in this size range include polymers, biological macromolecules, ceramics, metals, and alloys. The small-angle scattering patterns can be analyzed to characterize the size and shape

of the scattering centers as well as their

spatial distribution and surface area. Data

obtained from these experiments are complementary to data obtained from other dif- fraction studies and from morphological

studies using electron microscopy.

CAPABILITIES The NIST 10-m SAXS camera uses a 12-kW

rotating anode X-ray generator as a source

of X-rays. The target is usually copper ?i(Ka) = 1.54, but additional wavelengths

are available. The collimation path is defined so as to permit a

10'^ nm'' resolu- tion in reciprocal space at the surface of a two-dimensional position-sensitive proportional detector. The collimation path and

the scattered beam path are evacuated, and

all elements of vacuum operation. X-ray

optical configuration, sample selection, and

calibration are computer controlled. Image

data are collected by a minicomputer, and a complete collection of software is available

for displaying, analyzing, and modeling the

results.

Sample chambers are available for measure- ments at high temperatures and to deform

specimens during measurement.

APPLICATIONS The SAXS technique is used to study molecular conformation, microphase domain structures, crystallization phenomena, network

formation, craze initiation, void distribution, and similar phenomena resulting from

fluctuations in electron density within a

material. Such studies are currently of broad interest in all areas of materials

science.

AVAILABILITY

This facility is operated by members of the NIST staff in support of their active research program in polymeric materials. It is available for use by researchers from industry,

academia, and other government agencies on either a collaborative or independent

basis.

Contact: John D. Barnes

(301) 975-6786

email: johnbarnes@enh.nist.gov

B210 Polymer Building

MATERIALS SCIENCE

X-RAY BEAMLINES

NIST operates two beamstations on the X23A port at the National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory in New York. The light source

provides an intense continuous-spectrum

beam of collimated and polarized X-rays many orders of magnitude brighter than the beams provided by conventional laboratory

sources. These two beam stations offer

access to dedicated instrumentation for small-angle X-ray scattering. X-ray diffraction imaging (topography) and extended

X-ray absorption fine structure.

CAPABILITIES Small-angle X-ray scattering can be carried out in the photon energy range from 5 keV

to 1 1 keV. The minimum wavevector is

2 1 4 X 10 nm' and the wavelength resolu- tion is Kk/X = 10'^, enabling anomalous

small-angle scattering with excellent resolution. Diffraction imaging of single crystals and powders is carried out with monochromatic photons between 5 keV and 30 keV. An

energy-tunable X-ray image magnifier enables imaging of microstructure down to

less than 1 mm. The energy-scanning

experiments, primarily EXAFS, also are per- formed over an energy range from 5 keV to 30 keV.

APPLICATIONS

Small-angle scattering measurements on

ceramic and metallurgical materials are used to characterize the microstructure in

the 2-nm to l-|im size range as a function

of starting chemistry and processing

parameters. Scattering from a particular

entity can be separated from other scatterers

in a complex material using anomalous

small-angle X-ray scattering. Diffraction imaging is used to study imperfections and

strains in single crystals and powder compacts. The structure of strained semiconduc

tor interfaces and metal multilayers can be

studied using EXAFS. A combination of EXAFS and diffraction will provide a capabi

ity for site-specific local structure determine

tion in crystals.

AVAILABILITY Beam time is available to qualified scientists provided safety requirements are met

and scheduling arrangements can be made

Proposals for collaborative use of the facility are reviewed at NIST; proposals for inde- pendent use of the facility should be submitted to the NSLS.

Contact:

Gabrielle G. Long

(301) 975-5975

email: gabrielle@enh.nist.gov AI63 Materials Building
BUILDING AND FIRE

RESEARCH LABORATORY

COOPERATIVE RESEARCH

OPPORTUNITIES Major goals of the NIST Building and

Fire Research Laboratory- are to improve

the productivit}' of the U.S. construction

industrv', which now faces stiff competition from overseas firms, and to reduce

the human and economic losses result- ing from fires, earthquakes, wnds, and

other hazards. Through performance prei diction and measurement technologies,

as well as technical advances, the laboratory' works to improve the life-cycle quality' of constructed facilities.

The laboratory studies fire science and

fire safety engineering; building materials; computer-integrated construction

practices; and structural, mechanical, and environmental engineering. Products of the laboratory's research include measurements and test methods, per- formance criteria, and technical data

that are incorporated into building and

fire standards and codes. Staff members

are involved in more than 100 activities

to develop voluntary standards.

The laboratory conducts investigations

at the scene of major fires as well as

structural failures due to earthquakes,

hurricanes, or other causes. The knowledge gained from these investigations

guides research and is applied to recom- mendations for design and construction

practices to reduce hazards.

Contact: Richard N. Wright, Director

(301) 975-5900

email: wTight@micf.nist.gov

fax: (301) 975-4032

B2l6 Building Research Building

COOPERATIVE RESEARCH

OPPORTUNITIES

Structures

93 Structural, Earthquake, and Wind

Engineering

Building Materials

94 Cement and Concrete 94 Organic Building Materials

Building Environment

95 Lighting 95 indoor Air Quality 95 Refrigeration Machinery 95 Thermal Insulation 96 Building Controls 96 Computer-Integrated Construction

Fire Safety Engineering

96 Fire Protection Apphcations 97 Fire Modeling 97 Hazard Analysis 97 Large Fires

Fire Science

97 Advanced Fire Sensing 98 Smoke and Toxic Gas Prediction 98 Polymer Combustion Research

RESEARCH FACILITIES

98 Large-Scale Structures Testing

Facility 99 Tri-Directional Test Facility 99 Large Environmental Chamber

100 Calibrated Hot Box :|j 100 Line Heat-Source Guarded Hot Plate 100 Fire Research Facilities

STRUCTURES

Division Contact:

H.S. Lew

(301) 975-6061

email: hsl@micf.nist.gov

fax: (301) 869-6275 Bl68 Building Research Building

STRUCTURAL,

EARTHQUAKE,

AND WIND ENGINEERING

Under the National Earthquake Hazards

Reduction Program, NIST performs research and development work used in standards for the seismic safety of structures. Experimental and analytical research under way at NIST helps to develop knowledge for design and construction standards for new and

existing buildings and lifeline structures. The work involves identifying mechanisms

of failure and establishing criteria to ensure

structural safety.

Research is coordinated with researchers and practitioners from industry, academia, and federal and state governments. The

results provide designers and constructors with improved methods to predict and assess

the resistance of buildings and structures to seismic loads, guidelines for strengthening new and existing structures, and technologies to revise civil engineering related standards and codes.

Current research addresses:

• a rational procedure to determine

the ultimate shear strength of partially

reinforced masonry walls;

• strength and ductility of connections in

precast concrete structures;
94 BUILDING AND FIRE RESEARCH LABORATORY

• drift control criteria for flexible frames;

• evaluation criteria for base-isolation sys- tems and test procedures for evaluating the response of structures subjected to seismic

loading;

• strengthening methodologies for concrete frame structures; and

• effects of subsurface conditions on ground motion.

Other structural research includes:

• studies of structural performance for developing standards and test methods for high-performance concrete in major construction applications;

• response of low-rise structures and clad- ding to extreme wind loads;

• techniques and instrumentation for assessing the properties of existing structures and for developing technical criteria and methodologies for strengthening and

repairing existing structural members and

systems; and

• analytical and experimental methods for

identification of dynamic response characteristics of flexible members and structural networks.

Contact:

H.S. Lew

(301) 975-6061

email: hsl@micf.nist.gov

BI68 Building Research Building

BUILDING MATERIALS

Division Contact:

Geoffrey J. Frohnsdorff

(301) 975-6706

email: frohns@micf.nist.gov

fax: (301) 990-6891 B368 Building Research Building

CEMENT AND CONCRETE

NIST researchers are undertaking research

to develop a fundamental understanding of the relationship between chemistry, microstructure, performance, and service life of conventional and high-performance concrete and other inorganic building materials. Their goal is to develop tools for predicting the behavior of these materials and their service lifetimes. The service life of concrete largely depends on the rate of moisture ingress and of transport of dis- solved salts and gases in the pore system of

the concrete.

Models are being developed to consider service conditions, including the chemistry of the environment; the transport rate of reactants by diffusion, convection, and capillary

forces; and reaction mechanisms. Researchers are developing mathematical and simulation models to predict the relationships between pore structure and diffusion and

permeability of concrete.

Research projects include development and

validation of mathematical models of microstructure development in cement

pastes as the cement hydrates, the effects of microstructure on permeability and fracture

of concrete, and mechanisms of degradation of concrete. Artificial intelligence sys- tems are being developed for optimizing the

selection of materials and for diagnosing

the causes of material degradation. The

research is performed using a variety of tech- niques, including scanning electron microscopy, computerized image analysis, X-ray

diffraction, and thermal analysis.

This work will help the U.S. construction

industry be competitive in advanced concrete materials and construction. The

research is being coordinated with industry and voluntary standards organizations and

trade associations, the National Science Foundation's Center for Advanced CementBased Materials, and federal and state gov- ernment agencies.

Contact: James R. Clifton

(301) 975-6707 B348 Building Research Building

ORGANIC BUILDING

MATERIALS

NIST is conducting basic and applied

research to develop methods for predicting

the performance and service life of organic

building materials, such as protective coat- ings for steel, roofing materials, and

asphalt. Researchers at the Institute are investigating degradation mechanisms,

improving characterization methods, and

developing mathematical models of the degradation processes. Stochastic models,

which are based in reliability theory and

life-testing analysis, are included in the modeling efforts for coatings and roofing

materials.

To help in understanding the mechanisms

of degradation and provide data for models, 'i materials are characterized in many ways, t| including Fourier transform infrared spec- J

troscopy, thermal analysis, scanning elec- ijj

tron microscopy/energy dispersive X-ray, and visual and infrared imaging. Researchers also are developing improved ways to characterize atmospheric environments to which these materials are exposed. Characterization of environmental parameters that cause degradation is needed to link material properties with service life.
BUILDING AND FIRE RESEARCH LABORATORY

The NIST work provides a strong scientific

-ind technical basis for standards used by

industn'. The research is coordinated with

voluntar}' standards organizations and trade

associations, industry', and other federal agencies.

Contact:

Geoffrey Frohnsdorff

'301) 975-6706

email: frohns@micf.nist.gov B368 Building Research Building

BUILDING ENVIRONMENT

Division Contact:

' ivass E. Hill

^01) 975-5851

Tiail: jhill@enh.nist.gov

lix: (301) 990-4192 ^ E306 Building Research Building

ILIGHTING

[The NIST hghting program focuses on

^fundamental measurements of interior luminance and illuminance distributions,

light fixture output, and the interaction be- tween lighting and HVAC systems. NIST re- search-ers are working to develop improved

evaluation methods and design tools for de- sign and operation of efficient lighting sysjtems; test and rating methods to determine

^nerg\' performance of lighting fixtures and

svstems; and lighting qualit)' metrics sensiiiive to changes in obstruction, reflections,

different lighting configurations. Their

•research is performed in collaboration with

[industry organizations, including profesisional societies, trade associations, acade-

'mia, and federal and state governments.

i^urrent research includes a major project

,3n the measurement and modeling of the

[interaction of lighting and HVAC in a simulated interior office module. This research

'Will result in the development of a detailed :omputer model for predicting the effects of

iifferent types of lighting and HVAC systems. Modifications will be made to the facility in

the near future to study the effects of dimming, thermal mass, and external solar conditions.

Contact: Behnda L. Collins (301) 975-6455

email: bcollins@micf.nist.gov

A313 Building Research Building

INDOOR AIR QUALITY

Measurement and testing procedures, tech- nical data, and comprehensive indoor airqualitv' models are being developed by NIST

researchers as part of a multiyear program

to improve indoor air quality in buildings.

The results of this work produce improved

methods to predict and perform ventilation measurements for use by researchers and

practitioners to predict and design room

environments, including air distribution,

air qualit}', design ventilation systems, and

ventilation performance of existing systems.

Experiments are being conducted in several large buildings to develop test methods to evaluate how air moves into and within

large commercial buildings. The researchers are developing comprehensive computer

models to predict pollutant levels from

sources introduced into buildings from out- door air and those generated inside from

sources such as combustion equipment and

floor and wall coverings.

The first phase of the research is complete. Models exist that can predict indoor con- taminant levels as functions of emission,

dilution, and intrabuilding air movement. The models currently are being extended to model reactive contaminants.

Contact: Andrew K. Persily (301) 975-6418

email: andyp@enh.nist.gov A3 13 Building Research Building

REFRIGERATION

MACHINERY

NIST researchers are exploring refrigerant mixtures to improve the efficiency of refrig- eration cycles and replace harmful fluoro- carbon refrigerants that are believed to be damaging the ozone layer of the upper at- mosphere. Working with industry, they help

improve capabilities in determining the per- formance of refrigeration mixtures and help

refrigeration equipment manufacturers in designing refrigeration systems.

The researchers evaluate a wide variety of refrigeration cycles by using a breadboard

heat pump to "plug" and "unplug" circuits and components. The breadboard heat pump will be altered to test new refrigera- tion cycles. This is based on the results of a

theoretical study being conducted to find the optimal combination of mixtures and

appropriate refrigeration cycles for the best and most versatile performance. The "best"

of the advanced cycles will be selected and

equipment built and evaluated. A mini- breadboard that uses a very small charge

also has been built so that rare refrigerants

of limited production can be studied. Research findings are incorporated into appropriate standards and codes.

Contact: David A. Didion

(301) 975-5881

email: dad@enh.nist.gov B114 Building Research Building

THERMAL INSULATION

Researchers at NIST are developing basic data and simulation models for heat, air, and moisture transfer through building

envelope components. They are developing and validating a theoretical model for moisture transfer, completing research required

to develop a low-conductivity Standard

Reference Material (SRM), and refining a dynamic test procedure for building

components.
96 BUILDING AND FIRE RESEARCH LABORATORY

A 1-m guarded hot plate is used to develop SRMs; to determine thermal conductivity

values for various materials, such as CFC- blown insulation; and to provide measure- ment services to manufacturers and

researchers. A calibrated hot box is used to measure the steady-state and dynamic per- formance of full-scale wall systems.

This work provides the national "meterbar" for the thermal insulation industry. All advertised thermal insulation product per- formance is traceable to measurements made in this program.

Contact:

A. Hunter Fanney

(301) 975-5864

email: hunter@micf.nist.gov

B320 Building Research Building

BUILDING CONTROLS

NIST research is fostering the development

of more intelligent, integrated, and opti- mized building mechanical systems. A dynamic building/heating, ventilating, and

air-conditioning control system simulation program is used to study HVAC/control

system dynamics and interactions. An

expanded building management and controls laboratory is used to assist the building

controls industry in the development, evaluation, and testing of communication protocol standards for the open exchange of information. NIST technologies serve as a

basis for ASHRAE standards to assist the

control system manufacturers to develop

interoperable systems and methods for test- ing conformance to the standard.

The application of knowledge-based systems

to buildings is a new area of research. Plans

call for exploring how real-time models,

"tuning" techniques, forecasting, optimal

control theory, and a rule-based expert sys- tem can be combined to evaluate control system performance, make control strategy

decisions that optimize building performance, and perform diagnostics to advise the building operator or manager on build- ing operations, equipment problems,

or maintenance requirements. Work is under way to develop an HVAC/building

emulator/EMCS tester, which will provide a method for evaluating application

algorithms.

Contact: George E. Kelly

(301) 975-5870

email; gekelly@enh.nist.gov BII4 Building Research Building

COMPUTER-INTEGRATED

CONSTRUCTION

NIST researchers are developing rational techniques for defining and testing computer representations of information needed throughout the building process, from the conception of a building to its demolition. The goal of the program is to develop vali- dated neutral data representations for use in standards for accessing, exchanging, and

archiving information. As a corollary, the program seeks to develop testing methods

that assure consistency, completeness, and

correctness of information. The research draws on evolving information technologies, including knowledge engineering and

semantic modeling. Subject areas for research include standards and codes, engineering drawings, and product data.

Past research has resulted in methodologies

for representing, analyzing, and expressing

standards, and for interfacing standards to computer-aided design systems. Recent

results are being applied in the development and validation of national and international standards for product data. This work

led to the improved 3D Piping IGES Application Protocol (AP) to meet a high-priority data exchange requirement of industry and

government. It also has produced a prototype AP framework to provide a structure

to classify APs and to plan DOD ComputerAided Acquisition and Logistics Support Pro- gram APs and the work of the International Organization for Standardization's project on developing the Standard for the Exchange of Product Model Data.

Contact:

Kent A. Reed

(301) 975-5852

email: kreed@micf.nist.gov

B306 Building Research Building

FIRE SAFETY ENGINEERING

Division Contact: Andrew Fowell

(301) 975-6865

email: fowell@micf.nist.gov

fax: (301) 975-4052 B250 Polymer Building

FIRE PROTECTION

APPLICATIONS

The expedient transfer of scientifically based technology from NIST to the profes- sional user community and the creation of

a link between NIST computer-based activities and others doing similar or complementary work will enhance fire safety and

reduce its costs. Over the past decade, NIST

researchers have developed many computer

models of various aspects of fire. Researchers develop engineering systems for design

application and fire investigation, collect supporting data and programs, and operate

training programs and user workshops.

This work has resulted in advanced method

to solve fire safety problems, which are ther implemented through improved designs an

regulations.
BUILDING AND FIRE RESEARCH LABORATORY 97

In addition, NIST maintains the Fire Research Information Service (FRIS) conjsisting of national and international fire

: research literature and FIREDOC, the auto-

! mated database of fire research literature.

J FRIS is the only comprehensive national

I

library' resource for the fire community.

\ Contact:

j Richard Bukowski

!(301) 975-6853

lemail: bukowski@enh.nist.gov

'B250 Building Research Building

[FIRE MODELING

Predictive fire models need accurate representations of burning objects. The most

important of these for residences are upholIstered furniture and wall coverings. NIST

jresearchers are using both laboratory experi- iments and computer modeling to understand the processes that govern these t^'pes

of combustion. Algorithms are being

|developed and validated for use in hazard

lanalysis. This research results in improved

rediction methods of the rate and extent of

fire spread on interior room surfaces and

fumiture and the movement of fire products around buildings.

Contact:

.\ndrewj. Fowell

(301) 975-6865

email: fowell@micf.nist.gov

B250 Polymer Building

HAZARD ANALYSIS

The United States has one of the worst fire

records in the industrialized world. NIST

researches are helping to reduce the losses and the cost of fire protection by providing

scientific and engineering bases needed by

manufacturers and the fire protection comiiunity. One project involves the development of predictive, analytical methods that

permit the quantitative assessment of hazard and risk from fires. Researchers base

these methods on numerical modeling but

also include hand-calculation methods for estimating hazards and design curves/

tables to be used by architects and engineers. To ensure widespread use, the necessary data must be readily available, and

data input and presentation must be in terms readily understandable by the average

professional. Thus, the projects include a

strong emphasis on state-of-the-art computer graphics and computer-aided design

techniques.

The results of this research help manufacturers, purchasers, designers, code officials,

fire investigators, and practitioners evaluate

the fire hazard implications of the products

and fire protection strategies they use.

Contact: Walter W.Jones

(301) 975-6879

email: wwj@micf.nist.gov

A249 Polymer Building

LARGE FIRES

Large fires result from industrial or trans- portation accidents, natural disasters, arson, or when fire protection systems in constructed facilities fail to perform adequately. While these fires present a hazard

to building occupants, firefighters, and the surrounding area, little is known about

their characteristics, their growth and control, and methods of mitigating their impact. NIST is performing research and

developing techniques to measure, predict the behavior of, and better control large

fires. Large building fires involve the inter- action of strongly buoyant gas flows and

thermal radiation with complex structures. In some cases, sudden releases of fire gases erupt into uninvolved spaces through fail- ures of barriers or control systems. Experi- ments to evaluate the use of helium and

SF6 mixtures to measure the flow of strongly

buoyant fire gases in building structures

will provide a tool to reduce vulnerability to large fires.

NIST also is measuring smoke plumes from

large, open-air fires to help develop computer models that can predict their size and movement. Further fire dynamics research and advanced computational fluid dynamics will lead to methods capable of assessing

the local impact of large fires. These methods can be used by industry in preplanning

analysis for potential accidents or as technical support for emergency response.

Contact: David D. Evans

(301) 975-6899

email: evans@micf.nist.gov A345 Polymer Building

FIRE SCIENCE

Division Contact: Richard Gann

(301) 975-6864

email: gann@micf.nist.gov

fax: (301) 975-4052 B250 Polymer Building

ADVANCED FIRE SENSING

Fires that are detected and suppressed

quickly do little damage. NIST researchers

are studying new "fire signatures" that would enable the development of a new generation of detectors. The signals from these

detectors would be electronically analyzed

to alert occupants or suppression devices, perhaps even before flames exist. The re- search also is intended to understand and

provide technology for avoiding the high

false alarm rate of current detectors. Ad- vanced concepts for fire suppression chemicals, reduced explosion potential, and

Ik
98 BUILDING AND FIRE RESEARCH LABORATORY

RESEARCH

FACILITIES

minimizing collateral damage from the application of the suppressant also are being explored.

The results demonstrate the response of dis- criminating detection systems to early fire events and the performance of alternative suppressants that are consistent with regulatory and economic constraints of the fire protection systems manufacturers and the

industries and agencies that they serve.

Contact: William L. Grosshandler

(301) 975-2310

email: wgrosshan@enh.nist.gov

B356 Polymer Building

SMOKE AND TOXIC

GAS PREDICTION

Most people who perish in fires die from smoke inhalation. Many are exposed to this smoke for longer periods because the blackness of the smoke impedes their escape from

the burning building. NIST research is developing the scientific base and the predictive methods for the yields of carbon monoxide (the predominant toxicant) and

soot. These require improved knowledge of

the chemical and physical processes in flames, combined with the fluid mechanical

processes that dominate air entrainment

into fire plumes and the flow fields within a compartment.

The results of this research have been used

to formulate a global model of soot formation and oxidation processes, improve

strategies for incoqwrating chemistry into turbulent flow fields, and extend optical

investigations into flames where the effects

of chemisti7-turbulence interactions can be probed effectively.

Contact: George W. MulhoUand

(301) 975-6695

email: mulh@enh.nist.gov

B356 Polymer Building

POLYMER COMBUSTION

RESEARCH

The materials industry is seeking products

that are both low in flammabilit)' and will not pose environmental hazards over their

life cycle. NIST is working on several key

research areas needed to produce natural and synthetic polymers and composite materials that can meet these goals. One area is the measurement of flammability properties

by bench-scale methods, directly relevant to

real fires, and the development of mathematical models that use the measured flammability properties as inputs to predict fire performance of materials in the conditions

of actual use.

Another research area concerns approaches

to environmentally acceptable, char- forming flame retardant treatments for flaming and smoldering combustion. This

effort includes studying the physical and

chemical nature of char and how its properties can be enhanced. The experimental

work is complemented by theoretical modeling using molecular dynamics and quan- tum mechanics to develop a technical basis

for the design of a new generation of hre

resistant materials, which, while retaining

their intended-use properties, will be low in combustion toxicity and safe for the environment.

Contact: Takashi Kashiwagi

(301) 975-6699

email: tkfire@tiber.nist.gov

B258 Polymer Building

LARGE-SCALE STRUCTURES \ TESTING FACILITY

The NIST large-scale stmctures testing facility

consists of a universal testing machine (UTM)

that may be used with a 13.7-m-high reaction

buttress equipped with a horizontal hydraulic ram of 4.5-MN capacity. A combination of

hori2X)ntal and vertical forces may be applied

to large-scale specimens.

CAPABILITIES The UTM portion of the facility is a hydraulically operated machine of 53-4-MN capacity and is one of the largest in the world. It

tests large structural components and

applies the forces needed to calibrate very

large capacity force-measuring devices. It can apply compression forces to column sections or fabricated members up to 18 m in

height. The reaction buttress will resist hori- zontal forces to 4.5 MN from floor level to

12.2 m high. Flexure and tension specimens

may be subjected to forces up to 18 MN and

26 MN, respectively. Two-m-thick test floors

east and west of the machine may be used t(

tie specimens in place. |

A servo system has been added to the original manual controls of the UTM. It may be pro- grammed by function generator or computer

to create any desired loading function using

force, strain, or displacement as the variable.

Loads may be applied to a specimen by both

the UTM and horizontal ram. A four-rail trac system equipped with low-friction rollers has been used for concrete column tests. An "A" frame was used to resist horizontal reaction

forces generated by the ram and was attache

to the buttress at the desired height.
BUILDING AND FIRE RESEARCH LABORATORY 99

APPLICATIONS A testing program was conducted to evaluI ate the performance of concrete columns

J 1.5 ra in diameter and up to 9-1 m high,

i Another test series evaluated fracture propa-

•f gation in steel plates 1 m wide and 0. 1 m

1 and 0.15 m thick. A third experiment used

j the servo-control system programming

repeated loads applied to composite

specimens.

Low-c\'cle fatigue tests, destructive or ulti- mate loads, earthquake simulation in two

dimensions, and complex loading of components may all be accomplished in this

facility^ Servo operation of this machine

creates a unique potential for precisely controlled ver\' large forces applying to test components.

AVAILABIUTY

This facility, which must be operated by NIST staff, is available for cooperative or independent research. Tests should be

arranged as far in advance as possible as

special hardware may be needed for attaching specimens.

Contact: H.S.Lew m) 975-6061

email: hsl@micf.nist.gov Bl68 Building Research Building

TRI-DIRECTIONAL

TEST FACILITY

The tri-directional test facility at NIST is a computer-controlled apparatus capable of applying cyclic loads simultaneously in

three directions. It is used to examine the

strength of structural components or assemblages under the application of a variety of loading phenomena, such as an earthquake

or wind. This is one of the largest such

facilities in the world, both in terms of its high load capacity and its capability to handle large, full-scale specimens.

CAPABILITIES The facilit)' can apply forces and/or displace- ments in six directions at one end of a speci- men. The other end of the specimen is fixed. Specimens up to 3-3 m high x 3 m in length or width may be tested. The six degrees of freedom are translations and rota- tions in and about three orthogonal axes. The forces are applied by six closed-loop, servo-controlled hydraulic actuators that

receive instructions from a computer. Operating under computer control, the facility simultaneously maintains control of the load and/or displacements in each of the

three orthogonal directions. Loads may be

applied up to 2,000 kN in the vertical and

about 890 kN in each of the two horizontal

directions.

APPLICATIONS The test facility is limited only by the size of the test specimen. Loads may be cyclic or

unidirectional depending on the type of loading condition being simulated. The

facility is used to study masonry shear walls subjected to reverse cyclic lateral loading and precast concrete connections also subjected to reversed cyclic lateral loading. This

facility supports NIST's role in conducting

research for seismic design and construction standards in the National Earthquake

Hazards Reduction Program.

AVAILABILITY The tri-directional test facility is used by NIST staff in a variety of NIST research

projects and collaborative projects with

other agencies. It also is available for inde- pendent research but must be operated by NIST staff.

Contact:

H.S. Lew

(301) 975-6061

email: hsl@micf.nist.gov

Bl68 Building Research Building

URGE ENVIRONMENTAL

CHAMBER

The large environmental chamber is

14.9 m X 12.8 m x 9.5 m high. It has an

earth floor and may be excavated as needed

for building construction. The chamber is one of the largest of its kind, capable of accommodating two-story houses under

simulated environmental conditions. This chamber has been used for thermal performance, heating and cooling load measurements, and energy consumption studies of buildings of different kinds.

CAPABILITIES The chamber is capable of automatically

maintaining steady and/or dynamic temperature profiles from -45 °C to 65 °C and

humidity from 50 percent relative humidity

(rh) at 1.7 °C up to 35 °C dewpoint at 49 °C. A wider range of rh ( 15 percent to 80 percent) may be obtained manually. Air circulation maintains the temperature vari- ation within the chamber to within ±1 °C. Damper-control return ducts in all four corners of the chamber permit good air distri- bution. Supply air is furnished by ceiling

diffuse rs.

APPLICATIONS The chamber is used to measure indoor temperature fluctuation, heat loss and heat gain through building envelopes, energy

conservation and moisture condensation

studies, and air infiltration under simulated and dynamically fluctuating outdoor temperature cycles. The chamber has been used

to test a wide variety of conventional and

special structures and equipment, including

military hardware (such as inflatable life

rafts, relocatable air-inflatable hospital

units, and portable walk-in coolers) under

extreme climatic conditions.

li
BUILDING AND FIRE RESEARCH LABORATORY

AVAILABILITY

This facility, along with several smaller chambers (including one designed for vehicles), has substantial potential for use by

researchers in industry and universities. Collaborative programs and individual research can be arranged.

Contact: David A. Didion

(301) 975-5881

email: dad@enh.nist.gov

Bl 14 Building Research Building

CALIBRATED HOT BOX

The NIST calibrated hot box measures the heat transfer coefficient of full-scale build- ing wall sections. Designed in accordance

with ASTM Standard C976, it consists of two

large, heavily insulated chambers—an envi- ronmental chamber and a climatic chamber—each with one open side. Indoor and

outdoor conditions are simulated in the chambers. The open test section measures

3 m X 4.6 m. A well-insulated frame supports the wall specimen that is clamped

between the open sides of the two chambers.

CAPABILITIES

This facility is the only one of its kind

designed to perform simultaneous dynamic

transfer measurements of air, moisture, and

heat during simulated winter and summer

conditions under steady-state and dynamic

climatic conditions. While the environ- mental chamber temperature and humidity

are maintained to simulate a relatively

steady and narrow range of indoor conditions, the climatic chamber can attain temperatures ranging from -40 °C to 65 °C. The apparatus measures the perform- ance of homogeneous or composite walls having a range of thermal resistance from

0.35 m^ to 8.8 m^ • CP^. It accommodates

wall specimens up to 0.6 m thick and up to 700 kg/m in weight per unit area.

APPLICATIONS NIST researchers use the facility to develop standard test methods to evaluate dynamic

thermal performance of full-scale walls under cyclic temperature conditions. The

building industry and government agencies

are seeking reliable evaluation techniques

for wall thermal mass, especially to predict energy consumption of buildings with heavy mass effects in comparison to standard wood-frame buildings.

NIST has participated in round-robin test

activities with domestic and overseas ther- mal insulation laboratories.

AVAILABILITY The facility provides a unique opportunity

to measure simultaneous transfer of air, moisture, and heat through wall and roof specimens with openings for windows and

doors. While available for use by those outside NIST, this apparatus must be operated

by NIST staff.

Contact:

A. Hunter Fanney

(301) 975-5864

email; hunter@micf.nist.gov

B320 Building Research Building

LINE HEAT-SOURCE

GUARDED HOT PLATE

The 1-m guarded hot-plate apparatus measures thermal conductivity of building insulation. NIST researchers use the hot plate to provide calibration specimens for guarded

hot plates in other laboratories. The hot

plate also is used to investigate edge heat

loss from thick thermal insulation materials. This facility is the only one of its kind

in the world that will permit low-density

thick insulation to be measured with an

uncertainty of less than 0.5 percent.

CAPABILITIES

This apparatus has a test temperature range

of 80 °C for the hot plates and -20 °C for the cold plates. The apparatus permits meas- urement of vertical and horizontal heat flow

to simulate heat transfer through ceilings and walls, respectively. This apparatus operates within its own carefully controlled temperature and humidity environment

shielded by an insulated aluminum enclosure, This facility provides for absolute measurement of thermal resistance of thick and low-density test specimens used as transfer standards. These standards are used to calibrate or verify heat flowmeter (ASTM

C508) or guarded hot-plate (ASTM C177)

equipment.

AVAILABILITY

This apparatus is available for use by those

outside NIST, but it must be operated by NIST staff. Collaborative programs may be

arranged.

Contact:

A. Hunter Fanney

(301) 975-5864

email: hunter@micf.nist.gov

B320 Building Research Building

FIRE RESEARCH FACILITIES

As the federal government's principal fire research laboratory, NIST maintains some

of the country's best and most extensive fire

testing facilities. A substantial portion of NIST's fire tests are performed in a specially equipped fire research building, which

measures 27 m x 57 m and is designed for

large-scale fire experiments. Smoke abate- ment equipment permits large fire tests to be conducted safely without polluting the environment.

!

= I

il
BUILDING AND FIRE RESEARCH LABORATORY 101

In addition to several individual bum

rooms, which are modified from time-to- time to accommodate special NIST testing requirements, the facilit)' also houses several specially designed calorimeters for measuring the rate of heat release from

materials and large samples, a room/

corridor facilit>' for snjdying smoke and

toxic gas transport, pilot furnaces, and

reduced-scale model enclosures. Also, a

two-story "townhouse" is used to study fire spread from a burning room, smoke transport between levels, and sprinkler performance. The townhouse features a living room

that is continuously weighed, allowing the burning rate of finish materials to be measured.

A new computer-based data acquisition sys- tem provides state-of-the-art data collection

capabilities for all large-scale fire testing. Up to 300 instruments with scanning rates

over 100 channels per second can be dedicated to a single test. During an experiment,

real-time, full-color graphics present the data as collected, with automatic conversion to engineering units for gas analysis,

rate of heat release, temperature, and other measurements.

CAPABILITIES

• Heat-Release Rate Calorimeters. NIST pio- neered and developed the oxygen consumption methodology' for measuring the rate of

heat release and has used it longer and in more devices than any other laboratory. The

major benefit of this technique is the inde- pendence of the apparatus in measuring

enthalpy responses to changes in heat

release rate.

NIST has two calorimeters available for measuring the rate of heat release of free- standing items, such as pieces of furniture. The smaller one has a capacity of '/2 MW;

the larger, 7 MW. Provisions for measuring

smoke production and gas species yield are available with both instruments.

• Room/Corridor Facility. NIST researchers have constructed and used a room/corridor

facility to evaluate an analytical model that

predicts the transport of smoke and toxic gases from the room of fire origin into the corridor and secondary target rooms. The

design of this facility' makes it possible to measure the hazards associated with the burning of wall linings or room furnishings

by evaluating the rate of heat release, smoke production, and toxic gas generation. The facility is available in its present form or with design modifications for evaluating a variety of building contents and

furnishings.

• Bum Rooms. A standard burn room built

to ASTM specifications, 2.4 m x 3.7 m x

2.4 m high, adjoins a large overhead hood

that collects the exhaust products from the room fires. The exhaust collection system is calibrated to measure the rate of heat release and the generation rates of smoke and

other combustion products from the fire. The burn room is available for developmental and validation studies of mathematical models and for studies of fire performance

of furnishings and interior finish materials.

The room fire environment can be characterized in terms of temperature and pressure gradients and the spatial distribution of thermal flux, gaseous combustion products, and smoke. Other measurements permit the calculation of thermal losses to the room

boundaries and mass and energy flows from

the room. Smaller burn rooms also are

available.

• Pilot Furnaces. A pilot furnace for evaluating the fire endurance of wall assemblies

or floor/ceiling assemblies is available. This

furnace, capable of handling specimens

1 m X 1 m, may be used for research purposes only and cannot be used for code

acceptance testing. Typically, fire exposure

similar to that specified by ASTM E119, under carefully controlled conditions of fur- nace pressure and oxygen concentration, can be carried out. Depending on the parameters required, a variety of other exposure conditions can be applied.

• Reduced-Scale Models. NIST facilities are available for reduced-scale modeling of fullscale fire configurations. Physical models

offer an economical means of achieving sufficient variation of physical parameters for a generalized understanding of fire behavior. Based on the results of reduced-scale experiments, limited full-scale verification then can be performed.

AVAILABILITY

Industry, university, and government representatives are encouraged to use these fire

testing facilities on a collaborative or inde- pendent basis, with certain restrictions. For

safety reasons, NIST staff must closely supervise all use of the facilities.

Contact: Jack E. Snell (301) 975-6850

email: snell@micf.nist.gov

B2l6 Building Research Building
COOPERATIVE RESEARCH

OPPORTUNITIES

rii]iri|JI|id:i.i'kiidiVk

LABORATORY

l»(>lli usors .ind m.mul.u'lmvrs o{

k'on\|Hilor and Irlocomiuimicilious

Icviiuologv bonofil iVoiu Iho work ol' Iho

i'.omjHiIoi'Svsloius laboratory (CSl.V Its ivsoarch and (osling pix^grams foster the

oixlerly dowlopmonl ol' an "open sn'S- tems" onvii\Muuent intended lo make all

lorn^s of lnforn\atiou ttvhnology compatible and interoperable, l or mai\ufaelnrt'l's of haalwaiv and softwaiv. industrv-wido adoption of stmidiuxis expands marketing opporlnnities, and

usei'j; aiv lived of the constraints and

frustrations of incompatible pixiprletary

syslt'ms,

and assisuug nuinslr\ m dcvelopn\g

standanis lliat satisfy iisx^r nmis and \\>t

,',!le mtun,i!uM)s ih.i! dilTcren

K> .U ip iinvMiu.ituMi lu Icvieral

co'uiniler <;\s'('ni>;. LiboiMtiin pciNonnel

p(,iiuuaj'. v\ iuu\ pivgranis.

:jon, datalvise

use of information tivhnolouv

COOPf RAIIVH RESEARCH

OPPOHruNiriES

liilorni.Minn Systems Engineering

10.: [lalabaso lostiiuj

lO:: Geographic Intoiinalioii Systems

1 03 Computer Graphics Teslinri

Systems and Sottwnre Technology

103 Interlaces for Computer

Environments

1113 Intel active Media

103 Software Quality

Computer Security

1 04 Computer Systems Security 104 Security in ISDN and OSI Networks 104 Malicious Code and Related Threats 104 Datvi Encryption

Systems and Networit Architecture

Notwo'k MaiKuieinent

Hc\\\,'\k l^otocol fngineering 105 Automated Tiotocol Methods

Advanced Systsms

\\> \ices Digital Network

' Modem-Atchitecture

V

. ' " . \ .

.

" S

106 Oi.Hiuii L''iSK lOStS

logy

RESEARCH FACILITIES

)0

united Systems

INFORMATION SYSTEMS

ENGINEERING

PiristoH u>/i{<ict: David K. Jeffei"Son i30l) ^)^^ :>1(^1 email; ielfei"soti»'micf.nist.gov

fax: (30 n ^)48-b:i3

Technology Building

DATABASE TESTING

lo aid the management of information

ivsources. NIS T ivseaa'hers are developing

test methods and teclininues for evaluating

implementations of the database language

Si^M, and Information Resoua'e Dictionar\

S\>iem UKDS"* for conformance to federal,

national, and international standards. The

ivsearchers aa' attempting to derive a gener.d niethodologv for designing confor- mance tests, to use this methodology to generate test suites, and to evaluate the lest

suites for etTectiwness, ,\panot\pe implementation of the IRDS specifications, which

n\av be suitable for such tasks as i\iodeling

the structure of a standaal and for recoal- ing the parts of a standaal specifically

testevl, will be usal in this paiject.

Man H, Coldfine

email: agoldfiue^^nist.gov

,\Joo Technology Building

GEOGRAPHIC

INFORMATION SYSTEMS

Ccographic infcmuatiou systenrs t,GlSl tech oology allows uset^ to collect. nivUiage. and

aualyre large wluines of spatially rv?ferenct\l and assi^viatevi data. New rts<?:in:h

diarvtions ar^ emerv;ing frvMU the intenlisci
COMPUTER SYSTEMS LABORATORY

plinar)' uses of GIS technology through stud-

\ ies integrating computer graphics stand1 ards, database management standards,

i expert systems technology, and Global PosiI tioning Satellite technology to support GIS

li applications. This group's research is foj cused on providing GIS compatibility

j through standards and conformance testing

for GIS standards, such as the Spatial Data

Transfer Standard (TIPS PUB 173). Because

the activities of many governmental and pri- vate organizations are land and/or location

based, GIS technology will be important in integrating existing spatial data to administer, manage, and monitor people, money,

I and activities in accomplishing the objecI

tives of these organizations.

'! Contact:

j Henry Tom

(301) 975-3271

I email: htom@ecf.ncsl.nist.gov

] A266 Technology Building

•j COMPUTER GRAPHICS

! TESTING

The development of several graphics standards and work on related conformance test- ing and measurement techniques for graphics software are under way at NIST.

Specifically, NIST researchers are testing implementations of the graphical kernel sys- tem (GKS), the computer graphics metafile (CGM), and the programmer's hierarchical

interactive graphics system (PHIGS) for con- formance to existing and emerging federal, national, and international standards.

Researchers are attempting to derive a general methodology for designing confor- mance tests, to use this methodology to generate test suites, and to evaluate the test

suites for effectiveness. The computer graphics laboratory, which contains various computer graphics hardware and software

systems, is used in these efforts. Existing test

suites are available that determine confor- mance of GKS-FORTRAN implementations,

PHIGS-FORTRAN implementations, CGM

files, and CGM generators. Future test suites

developed will concentrate on GKS-C implementations, PHIGS-C implementations, and

CGM interpreters.

Contact: Mark W. Skall (301) 975-3265

email: skall@ecf.ncsl.nist.gov A266 Technology Building

SYSTEMS AND SOFTWARE

TECHNOLOGY

Division Contact: Roger J. Martin

(301) 975-3290

email: rmartin@sst.ncsl.nist.gov

fax: (301) 926-3696 B266 Technology Building

INTERFACES FOR

COMPUTER ENVIRONMENTS

For the past several years, NIST has collaborated with vendors, users, and voluntary

standards organizations to advance the implementation and use of the POSIX family of standards. POSIX promotes the portability of computer applications at the source code level. NIST researchers continue

to work with voluntary standards committees to develop additional standards needed

for interfaces to operating systems, includ- ing commands and utilities, system administration, and operating system security. Research efforts focus on the large-scale, heterogenous distributed systems aspects of NIST's Application Portability Profile for Open System Environments. These specifications integrate federal, national, and inter- national standards to provide functionality needed for a broad range of government

information technology applications.

Contact:

Frederick E. Schulz

(301) 975-2192

email: schulz@sst.ncsl.nist.gov

B266 Technology Building

INTERACTIVE MEDIA

Portable multimedia courseware (computerbased interactive training software) provides a viable alternative to the current practice

of distributing courseware with proprietary

interfaces to system services. NIST and other

federal agencies are working together to develop a strategy for multimedia course- ware that would create an environment in which high-quality portable courseware is available as commercial, off-the-shelf products competitively supplied by vendors. Researchers are developing a computerbased interactive training applications profile that would identify needed standards in response to user needs.

Contact: Lawrence A. Welsch

(301) 975-3345

email: lwelsch@nist.gov B266 Technology Building

SOFTWARE QUALITY

Growing dependence on computers requires assurance that critical systems will operate

reliably and exactly as intended without

adverse effects, even when outside circumstances cause other systems to fail. NIST

researchers are studying problems and

potential solutions in building and operat- ing high-integrity systems and are looking

at life-cycle methodology, risk management, formal methods, object-oriented

design, software reliability, clean-room

techniques, and formal verification.

Contact: Roger J. Martin

(301) 975-3290

email: rmartin@sst.ncsl.nist.gov

B266 Technology Building
COMPUTER SYSTEMS LABORATORY

COMPUTER SECURITY

Division Contact:

Stuart W. Katzke

(301) 975-2934

email: katzke@stl.ncsl.nist.gov

fax: (301) 948-1233 A2l6 Technology Building

COMPUTER SYSTEMS

SECURITY

Computer systems are vital elements of today's business and scientific environ- ments. However, as sensitive and critical information is processed and stored on computer systems often interconnected by local area networks, there is an increasing need

for methods to protect that information from unauthorized access or modification. But selection of information security measures should be based on cost analysis of such measures and the resulting reduction

in losses. NIST researchers are investigating various technologies that can be used to achieve additional control and security of information on computer systems. Their

research involves the identification, analysis, development, and application of these technologies.

Although it is desirable to have security

mechanisms as an integral part of computer

systems and networks, this is not always possible or economical because such mechanisms often are not part of the original

system design. NIST researchers also are examining the technology available to enhance the security of existing systems. This research involves identifying, analyzing, and companng security mechanisms

used in isolation or combination.

Contact:

Stuart W. Katzke

(301) 975-2934

email: katzke@stl.ncsl.nist.gov

A2l6 Technology Building

SECURITY IN ISDN AND

OSI NETWORKS

NIST has initiated a laboratory-based pro- gram to bring together government organizations and contractors interested in

interoperability and security in the Open

Systems Interconnection (OSI) computer

network architecture and the Integrated

Services Digital Network (ISDN) communications architecture. Researchers develop

prototype systems to demonstrate the

interoperability of proposed standards for OSI and ISDN using a selected set of security

services. These standards are expected to be implemented in commercial applications with a broad market.

Researchers plan to develop demonstration

prototypes of applications and equipment,

including hardware and software, that provide one or more levels of security in an OSI

and/or ISDN environment. Specifications

will be developed for data formats, protocols, interfaces, and support systems for

security in an OSI/ISDN environment that can be used as a basis for Federal Information Processing Standards. Users, developers, and vendors jointly can define, develop,

and test systems that will provide a range of telecommunications, network management,

and security services in a distributed infor- mation processing environment.

Contact:

Stuart W. Katzke

(301) 975-2934

email: katzke@stl.ncsl.nist.gov

A2l6 Technology Building

MALICIOUS CODE AND

RELATED THREATS

Operators and users of computer systems and networks are experiencing an increased number of incidents of malicious code

(such as computer viruses and "worms"),

unauthorized access ("hackers," for example), and similar threats. Protection from

such threats requires a combination of management awareness, user involvement, and

technical protection.

NIST researchers are actively involved in improving each of these areas. Their

research involves an understanding of both

the potential technical vulnerabilities of systems and of how systems are used and

administered. Advanced methods of system

protection, anomaly detection, system selfaudit, and related techniques are being

developed. In addition, methods of rapid

reaction and response to computer security incidents are being developed and coordi- nated throughout the federal government.

Contact:

Stuart W. Katzke

(301) 975-2934

email: katzke@stl.ncsl.nist.gov

A2l6 Technology Building

DATA ENCRYPTION

NIST researchers are working with industry

and voluntary standards groups to advance

technology and to develop standards in computer cryptography, a mathematical process

that transforms information to an unintelligible form in a process called encryption

and then back to an intelligible form, the process of decryption. Cryptography can be used to protect the secrecy of information,

to generate codes that indicate whether any

unauthorized changes have been made to a message while in transit on a network or

stored in a computer, to authenticate users

of systems, to control access to systems, and

to electronically sign documents.

Research projects involve the development and evaluation of techniques for secret key

and public key cryptography applications, and for validation systems that test equip- ment for conformance to cryptography

standards. As new national networks are developed, cryptographic-based security serv-
COMPUTER SYSTEMS LABORATORY 1 05

ices will be needed to protect data and

resources in distributed processing systems.

Contact: Smart W. Katzke

(301) 975-2934

email: katzke@stl.ncsl.nist.gov

A2l6 Technology Building

SYSTEMS AND NETWORK

ARCHITECTURE

Division Contact:

Kevin L. Mills

I (301) 975-3618

email: mills@osi.ncsl.nist.gov

fax: (301) 590-0932 B217 Technolog)' Building

NETWORK MANAGEMENT

NISI researchers are working with industry

to establish standards for exchanging net- work management information between

heterogeneous management systems. Their

goal is to establish a standard enabling integrated, interoperable, automated management of multivendor computer systems,

routers, bridges, switches, multiplexors,

modems, and provider services.

The researchers are defining protocols for exchanging management information; identifying, collecting, and specifying the for- mat of managed objects; defining protocols

to support management functions in the

areas of fault, configuration, performance,

security, and accounting; and implementing prototype management systems reflect- ing the protocols and specifications. Other

areas include network management user displays, network management applications

software development, and application of

expert systems to network management.

Contact: Fran Nielsen

(301) 975-3669

email: nielsen@mgmt.ncsl.nist.gov B217 Technology Building

NETWORK PROTOCOL

ENGINEERING

NIST researchers in the area of network protocols are promoting the standardization, convergence, and commercialization of networking technology. Research projects

involving network applications are focused on promoting standardization of security

services such as distribution and manage- ment of encryption keys and the design of a

specialized protocol for the negotiation of a wide range of security services and their related parameters.

Research projects involving lower layer net- work applications include promoting the convergence of network addressing schemes

used in OSI stacks and in the Internet envi- ronment. NIST researchers prototype conver- gent schemes to demonstrate viability and promote acceptance. Lower-layer research

also includes promoting the standardization of multicast transport and routing

algorithms. Additional work focuses on

interoperability testing of dynamic network

routing and frame relay products.

Contact: Michael L. Ransom

(301) 975-3635

email: ransom@osi.ncsl.nist.gov B217 Technology Building

AUTOMATED PROTOCOL

METHODS

NIST researchers are designing tools for

editing, compiling, and interpreting computer communications protocol specifications. The goal of the research is to advance

the state of the art in using such tools to

realize automatically executable implementation of the protocols. As part of this project, NIST researchers are developing a

syntax-directed editor for Estelle and, using

the same grammar, devising a portable compiler for Estelle and the supporting runtime

libraries.

Contact:

J.P. Favreau

(301) 975-3634

email: favreau@osi.ncsl.nist.gov B217 Technology Building

ADVANCED SYSTEMS

Division Contact: Shukri A. Wakid

(301) 975-2904

email: wakid@ecf.ncsl.nist.gov

fax: (301) 840-1357 A231 Technology Building

INTEGRATED SERVICES

DIGITAL NETWORK

In cooperation with industrial and other

users, NIST advances the development of standards for Integrated Services Digital Net- work (ISDN), which combine voice, data,

text, and image communications over a single network connection. Research in this area focuses on the measurement capabilities and testbed facilities required to develop conformance tests and performance metrics

for emerging ISDN standards. Activities in- clude support for standards writing, develop- ment of the technical foundation for implementation agreements on protocol

options, and testing ISDN implementations

for interoperability. NIST researchers also are involved in the research and standardization of B-ISDN-based protocols as well as FDDI conformance tests.

Contact: David Su

(301) 975-6194

email: su@isdn.ncsl, nist.gov B364 Materials Building

III
COMPUTER SYSTEMS LABORATORY

PERFORMANCE OF

MODERN-ARCHITECTURE

COMPUTERS

NIST researchers in the area of computersystems performance are promoting the

effective evaluation and efficient use of advanced computers by the federal govern- ment. Their areas of interest include: characterization of new computer architectures

to identify improved ADP technology for

applications; exploration of economical pro- gramming methods that standardize across

classes of architecture; and design of coherent evaluations that economically and reli- ably characterize the machines. Two

dedicated, instrumented multiprocessors

serve as special project resources. One has

16 nodes loosely coupled as a hypercube;

the other has I6 processors in a shared- memoi7 configuration.

These NIST researchers also are involved in

the development of instrumentation and

related management techniques for gigabit networks used for visualization-based

applications.

Contact: Gordon E. Lyon

(301) 975-5679

email: lyon@nist.gov

B364 Materials Building

OPTICAL DISK TESTS

As industrial standards for optical disk media evolve, test methods will be needed

for conformance testing of the media. NIST

researchers develop and demonstrate data/ media interchange tests to verify confor- mance to established or planned national and international standards for rewritable and write once, read many (WORM) type

optical disks. The program is coordinated

with voluntary standards committees and

interested federal agencies.

Contact: Dana S. Grubb

(301) 975-2915

email: dana@pegasus.ncsl.nist.gov A61 Technology Building

DISTRIBUTED SYSTEMS

NIST researchers are developing application

profiles that will promote integrated plat- forms for video, imagery, computer data, and voice, thus defining multimedia appli- cations in a distributed processing environ- ment. This research focuses on prototype development and demonstration using ISDN

technology.

Contact: Wayne H. McCoy

(301) 975-2984

email: mccoy@dsys.ncsl.nist.gov

A2l6 Technology Building

SPOKEN LANGUAGE

TECHNOLOGY

Recent advances in automatic speech recognition and understanding technology have

resulted in computers able to recognize correctly continuous speech with lexicon sizes

of at least 1,000 words. Speech databases are

typically large in size (gigabytes) and too

costly for any one organization to develop.

To improve the technology, the research community relies heavily on shared use

of the databases and standard test methodologies.

With support from the Defense Department's Advanced Research Projects Agency and

other agencies, NIST has collected speech

database material and, using CD-ROM tech- nology, distributed this material to more

than 100 research organizations. Researchers at NIST also have developed CD-ROM

format speech databases that are used for

speech recognition research in large

vocabulary speech (5,000-word office corre- spondence), word spotting, speaker identification/verification, and goal-directed

spontaneous speech. Among the research

facilities used are several Sun Microsystems

workstations, speech-processing peripherals

and software tools, and CD-ROM production

tools. Areas of interest include characterization of the speech database materials (such as acoustic-phonetic locators and

classifiers), artificial neural nets, perform- ance measurement, and natural languages.

Contact: David S. Pallett (301) 975-2935

email: dave@jaguar.ncsl.nist.gov

A2l6 Technology Building

IMAGE RECOGNITION

Image recognition research at NIST focuses on developing methods for evaluating

image quality, compression efficiency, and image systems used in optical-character

recognition. These evaluation methods are designed to include highly parallel computers and special-purpose chips as well as conventional computer architectures. The

methods being developed are used for auto- mated fingerprint recognition, automation

of data entry from images of forms, and measurement of recognition systems on realistic applications. A general model of the recognition process in parallel computers is being implemented to provide better methods to analyze the performance of SIMD

(single-instruction, multiple-data) computers for image compression, image-quality

evaluation, and recognition accuracy.

Contact:

Charles L. Wilson

(301) 975-2080

email: wilson@magi.ncsl.nist.gov

A2l6 Technology Building
COMPUTER SYSTEMS LABORATORY

RESEARCH

FACILITIES

I INFORMATION SYSTEMS

I ENGINEERING FACILITY

j The NISI information sy stems engineering

j facilitv' consists of laboratories with the comj puter hardware and software needed for re-

! search and development of standards,

I guidance to federal agencies, and validation

I tests. The following areas are included:

I graphics; programming languages; dataI base management systems; distributed

j database management systems; object dataI base management systems; data dictionary

systems; data administration, especially database design; data interchange;

; knowledge-based and expert systems; hypertext and hypermedia; and geographic

! information systems (GIS).

' CAPABILITIES

j The facilit}' contains a variety of computers.

Among them are a VAX 1 1/785, Symbolics

I 3650 LISP machine, 386 and 486 microcomputers, Macintosh II, Silicon Graphics

^ IRIS workstation, and a SUN SPARC II workstation. Other computer s\'stems, such as the NIST Cray Y-MP supercomputer, are accessible. Also available are a variety of hard-copy

output devices, such as laser printers, camera output systems, and color thermal transfer printers.

Software used in the facility includes:

( • graphical kernel system (GKS) and pro- grammer's hierarchical interactive graphics

sy^stem (PHIGS) implementations, which

allow graphics programmers to design a

wide variet)' of graphics programs, ranging from simple passive graphics to complex

real-time systems;

• computer graphics metafile (CGM)

implementations that permit transfer of graphical pictures among heterogeneous

graphic devices;

• a variet}^ of programming language

processors and system software;

• database management systems for the VAX, workstations, and microcomputers

supporting SQL and object technologies;

• a prototype implementation of the Infor- mation Resource Dictionary System (IRDS)

standard;

• LISP and Prolog;

• microcomputer expert system shells; and

• GIS systems.

Validation suites are available for testing conformance to Federal Information

Processing Standards (FIPS) for COBOL,

FORTRAN, Pascal, C, MUMPS, Ada, GKS,

CGM, and database language SQL. Testing

services are provided for COBOL, FORTRAN,

Pascal, C, MUMPS, Ada, GKS, CGM, and SQL.

APPLICATIONS An active area of cooperative work is the development and evaluation of tests to vali- date the conformance of language processors and other system software to FIPS. Major programs under way are validation

of the programming language processors COBOL, FORTRAN, Pascal, C, MUMPS, and

Ada; validation of the GKS, PHIGS, and CGM

graphics systems; validation of database language SQL; and validation of IRDS.

Possible future work includes the develop- ment of tests and procedures for validating additional programming language systems, such as \TISIC Hardware Description Language, LISP, and Prolog; for validating the computer graphics interface; and for validat- ing the following data management and

data interchange software: SQL2, SQL3, data

description file for information interchange,

and abstract syntax notation one (ASN.l).

AVAILABILITY The facility, which must be used under the guidance of NIST staff, is available for col- laborative projects in test development and

application research.

Contact: David K. Jefferson (301) 975-3262

email: jefferso@micf.nist.gov A266 Technology Building

COMPUTER AND NETWORK

SECURITY FACILITY

The NIST computer and network securit)' facihty is used to improve the current security' posture of federal computer and tele- communication systems and to provide

securit)' for these systems as they migrate

toward open system environments. Research performed in the facility is aimed at applying methods to protect the secrecy and integrit}' of information in computer systems and

data networks; evaluating personal identifi- cation and authentication techniques to control access to information resources; and

developing computer and network security' architectures to determine proper implementation of controls for integrity' and confidentiality of information and authentication of

users.

CAPABILITIES The facility is equipped with mini- and

microcomputers, security devices, terminals, personal identification systems, and access

to large mainframes and supercomputers

through local area, national, and global

netivorks. A variety of communications tech- nologies and applications environments are

available for research efforts, including

Open Systems Interconnection and Inte- grated Services Digital Network for developing and testing security protocol standards.
COMPUTER SYSTEMS LABORATORY

Operational capabilities include a computer emergency response team to facilitate identification and response to acute computer

and telecommunications security incidents involving self-replicating computer viruses. Test and evaluation capabilities range from

specific functionality tests of cryptographic

modules to test methodologies for network

security protocols to the specific criteria used to evaluate the trustworthiness of sys- tems that handle unclassified, but sensitive,

data.

A risk management laboratory, utilizing a

Dell System 325 (AT clone), is available for research in risk management techniques

and methodologies and evaluation of risk management software to determine applicability to different agency environments. Three Sun computers support the develop- ment of advanced-computer access control systems based on smart-token technology.

The virus laboratory uses two IBM PS/2 Model 60s, a Sun workstation for research

in multiuser environments; and a Macintosh SE for research in the MacOS

environment. A small systems security laboratory completes the computer and network

security facility.

APPLICATIONS The facility is used primarily to develop and

test federal standards for computer and net- work security. Support is provided to other

federal agencies and industry where the protection of unclassified data is required.

AVAILABILITY

Collaborative research programs can be

arranged.

Contact:

Stuart W. Katzke

(301) 975-2934

email: katzke@stl.ncsl.nist.gov

A2l6 Technology Building

ISDN AND DISTRIBUTED

SYSTEMS FACILITY

The NIST Integrated Services Digital Net- work (ISDN) and distributed systems facility provides laboratories for research and devel- opment, standards, and conformance test- ing in distributed computer systems and

advanced computer communications,

including ISDN and the fiber distributed data interface. Significant research and de- velopment programs include open distrib- uted systems, transaction processing,

distributed multimedia, ISDN applications, ISDN conformance testing, and broadband

ISDN.

CAPABILITIES The facility is equipped with microcomputers, workstations, minicomputers,

multimedia display units, ISDN and

Ethernet communications, and laser printers. Access to mainframes and supercomputers is provided via local, national, and

global networks. The laboratories have eight

basic rate interface (BRI) ISDN lines, three Sequent computers (S27, S81), five Sun

workstations, four 386-class microcomputers, four ISDN terminal adapters, four ISDN telephones, two ISDN protocol

analyzer/emulators, and two Macintosh

microcomputers. Researchers access pri- mary rate interface ISDN as well as the BRI. The laboratories also feature software for compiling formal descriptions of distributed systems into implementations, tool kits for programming distributed systems, user interfaces, and advanced operating systems such

as MACH.

APPLICATIONS

Facilities are used primarily for developing

and testing federal, national, and international standards for advanced communications and distributed multimedia systems.

Research activities support the North Ameri- can ISDN Users' Forum (NIUF), chaired by

NIST. The forum was established by NIST

with industry in 1988 to create a strong user

voice in the implementation of ISDN applications. Through the forum, users and

manufacturers concur on ISDN applications, the selection of options from standards, and conformance tests. NIST works

with the forum to develop tests that deter- mine whether the agreed-to specifications

will result in compatible products and

services.

A principal focus is standards conformance

test design for ISDN implementations based on recommendations of the International Telephone and Telegraph Consultative Committee. NIST has developed reference implementations for the Q.921 and Q.931

recommendations, conformance test suites

for both recommendations, and a confor- mance test system based on these items. In

addition, conformance research on broad- band ISDN is conducted.

Also under development are application

profiles for ISDN, research in distributed computing environments, and prototype

distributed multimedia information systems based on ISDN and other communications

media. Researchers have produced a distrib- uted reference implementation for the Inter- national Standard Transaction Processing

Protocol directly from a formal specification and are investigating how transactions support multimedia information access and

cooperative processing.

AVAILABILITY

Collaborative research programs with gov- ernment, industry, and academia can be arranged and are encouraged.

Contact: Shukri A. Wakid

(301) 975-2904

email: wakid@ecf.ncsl.nist.gov A231 Technology Building
COMPUTING AND APPLIED

MATHEMATICS LABORATORY

COOPERATIVE RESEARCH

OPPORTUNITIES The NIST Computing and Applied Mathematics Laboratorv' develops mathematical, statistical, and state-of-the-art

scientific computing tools that help

other NIST researchers and their coUaborators accomplish their research

objectives. NIST mathematicians and

statisticians also support U.S. industry

through computer-aided modeling of complex manufacturing processes and

statistical methods for improving the

quality of products and processes.

Other research programs focus on

advanced computer graphics pro- grams that produce two- and three- dimensional visualizations of complex

problems; new methods for displaying,

manipulating, analyzing, and transmitting large volumes of data; and software applications for harnessing the problemsolving power of parallel processors, an

effort carried out in conjunction with

the federal government's raultiagency program on high-performance computing and communications.

Contact: Joan R. Rosenblatt, Director (301) 975-2733

email: jrr@cam.nist.gov

fax: (301) 963-9137

Bl 18 Technolog)' Building

COOPERATIVE RESEARCH

OPPORTUNITIES

Applied and Computational

Mathematics

109 Scalable Parallel Algorithms 110 Non-Linear Mechanics 110 Mathematical Modeling 110 Optimization and Computational

Geometry 110 Mathematical Software

Statistical Engineering

111 Industrial Experiments

1 1 1 Measurement Assurance

Scientific Computing Environments

111 Scientific Visualization

Continual Upgrades

APPLIED AND

COMPUTATIONAL

MATHEMATICS

Division Contact: Paul T. Boggs

(301) 975-3816

email: boggs@cam.nist.gov

fax: (301) 990-4127 A238 Administration Building

SCALABLE PARALLEL

ALGORITHMS

A major problem for users of massively

parallel computers is the lack of libraries of commonly used subroutines. Algorithms

and computer codes developed for single- processor machines rarely give massive

speedups when transferred to massively

parallel computers.

NIST researchers concentrating on algo- rithm research for massively parallel computations are making substantial progress

in algorithms for important problems in computational geometry, such as triangulation in two and three dimensions. Additional research focuses on random

processes, including Monte Carlo simulations and randomizing algorithms.

Contact:

Isabel Beichl

(301) 975-3821

email: isabel@cam.nist.gov A238 Administration Building
1 1 0 COMPUTING AND APPLIED MATHEMATICS LABORATORY

NON-LINEAR MECHANICS

Mathematical analysis, used with symbolic

computation, leads to efficient analytical

approximations by computers. Perturbation algorithms applied to non-linear differential equations, especially in celestial mechanics, result in analytical develop- ments where the complexity grows exponentially with the order of the approximation.

Several avenues are being explored at NIST

to simplify literal developments generated

by perturbation algorithms applied to nonlinear systems. These include identifying

algebraic structures on the domain of the normalization, smoothing transformations

to eliminate perturbation terms outside the kernel of the Lie derivative, preparatory transformations of a geometric nature, and

creating natural intermediaries.

Problems being examined include reso- nances at an equilibrium, perturbed pendulums, and the major theories of celestial mechanics. NIST researchers, using a LISP

computer, are focusing their studies on algo- rithms amenable to computer automation

through symbolic processors.

Contact: Andre Deprit (301) 975-2709

email: deprit@enh.nist.gov A302 Administration Building

MATHEMATICAL

MODELING

Mathematical and computational problems

are becoming more elaborate as measure- ment techniques, physical understanding,

and computational capability improve. Solv- ing these problems requires innovative combinations of the methods of modern applied

and computational mathematics. With scientists and engineers, NIST mathematicians

develop and analyze mathematical models

of phenomena; design and analyze computational methods and experiments; trans- form these methods into efficient numerical

algorithms for modern, high-performance

computers; and implement them in highquality mathematical software. Active areas

of interest include crystal growth, fluid flow, electromagnetic waves, magnetic materials, molecular dynamics simulations, partial

differential equations, and several kinds of inverse problems.

Contact: James L. Blue

(301) 975-3809

email: blue@cam.nist.gov

A238 Administration Building

OPTIMIZATION AND

COMPUTATIONAL

GEOMETRY

In many aspects of NIST's research, the need arises for computational procedures, such as curve fitting, parameter estimation,

and maximum entropy calculations. These

activities require solving various types of optimization problems. NIST researchers

investigate many aspects of numerical

optimization, including large-scale linear and quadratic programming problems by

interior-point methods, and the extension of

these procedures to general large-scale nonlinear programming problems via sequential quadratic programming methods.

Researchers also have developed procedures

for non-linear least squares and ortho- gonal distance regression problems, and

they produce software for these methods as needed.

Computational geometry is a rapidly emerging field with applications in robotics, statistical mechanics, cartography, computer

graphics, materials science, and molecular

dynamics. Researchers at NIST develop

robust and efficient computational schemes

to compute triangulations and shellings of point sets, Voronoi diagrams, and other geometrical calculations. Algorithms for two- and three-dimensional triangulation are implemented for sequential and parallel machines and are used at NIST and other

scientific centers.

Contact: Paul T. Boggs

(301) 975-3816

email: boggs@cam.nist.gov

A238 Administration Building

MATHEMATICAL

SOFTWARE

The increasing prevalence of computation

in science and engineering has generated an acute need for accurate and robust computer software to solve frequently occurring

mathematical and statistical problems. NIST mathematicians and computer scientists are actively involved in the develop- ment of algorithms for the solution of such problems on modern high-performance

computers. These algorithms are then implemented in well-engineered software that is both reliable and easy to use. Problem areas addressed by recent efforts have ranged from

the parallel evaluation of mathematical

functions to the high-speed solution of

partial differential equations on vector supercomputers.

This work engenders associated research in mathematical software methodology such

as software parts design, graphical user

interfaces, expert advisory systems, and auto- mated distribution mechanisms. Recent
COMPUTING AND APPLIED MATHEMATICS LABORATORY 1 1

1

efforts have focused on the Guide to Availij able Mathematical Software, a network- based software repositor\' system developed

at NISI.

Contact: Ronald F. Boisvert

(301) 975-3812

j email: boisvert@cam.nist.gov

A238 Administration Building

STATISTICAL

ENGINEERING

Division Contact:

Robert]. Lundegard

(301) 975-2840

email: lund@micf.nist.gov

fax: (301) 990-4127 A337 Administration Building

INDUSTRIAL

EXPERIMENTS

Most NIST/industry collaborative research

projects involve conduct of experiments,

generation of data, and analysis of the

results. NISI statisticians participate in

these collaborations by contributing strategies for experimentation, graphical and analytical data analysis, stochastic empirical

modeling, estimation of uncertainty', computationally intensive methods, and fitting

of reliabilit}' distributions. A Senior Research Fellowship Program funded by the National Science Foundation and managed

by the American Statistical Association en- courages formation of NIST collaborative re- search projects keyed to industrial needs.

Ongoing collaborative research projects include the following:

• development of a non-contact sensor for measuring the temperature of hot rolled aluminum;

• comparison of various methods to machine ceramic piece parts;

• determination of optical-fiber geometry

by gray-scale analysis with robust regression;

• non-destructive evaluation of the concentration of impurities and dopants in hightechnology materials through neutron

depth profiling;

• optimization of parallel processing

MIMD programs;

• modeling of the measurement errors in automated milling machines;

• sampling data points for the effective use

of coordinate measuring machines;

• friction characterization of ultralow speed turning machines;

• evaluation of properties and processing

of recycled concrete; and

• analysis of the failure laws for electro- migration and accelerated testing.

Contact: Raghu N. Kacker

(301) 975-2109

email: kacker@cam.nist.gov A337 Administration Building

MEASUREMENT

ASSURANCE

Measurement is the backbone for advancing

scientific research and creating new technologies. NIST statisticians collaborate with

subject experts in developing techniques for

t>'ing measurement processes to accepted standards and assuring the quality of measurements. Expertise in the design of experi- ments, modeling, estimation of components

of variance, reliability, and computerintensive methods, coupled with a strong

research focus, brings statisticians into contact with leading researchers in measure- ment science, both at NIST and abroad. It

also provides opportunities for contributing

to the measurement science base for emerging technologies.

In the initial phases of such programs, models for describing the error structure of the measurements are developed and validated by planned experimentation, and problem

areas are identified through estimation of error components. The initial characterization, which may require several rounds of experimentation and produce

refinements to the measurement process,

is followed by the development of artifact standards for applying the technology to the area of interest.

For example, statisticians are currently

working with NIST scientists in cooperation

with the Federal Bureau of Investigation on

developing standards to assure the quality

of DNA measurements that are introduced

as physical evidence in legal proceedings. This phase of the program follows an

intense phase of experimentation and data

analysis where sources and magnitudes of

error in measuring DNA fragments were

determined.

Contact:

Carroll Croarkin

(301) 975-2849

email: croark@cam.nist.gov A337 Administration Building

SCIENTIFIC COMPUTING

ENVIRONMENTS

Division Contact: Robert Raybold

(301) 975-3834

email: raybold@cam.nist.gov

fax: (301) 963-9137 B146 Technology Building

SCIENTIFIC VISUALIZATION

Researchers at NIST are developing and

applying advanced methods for using stateof-the-art, computer-based scientific graphics for rendering complex experimental.

II
COMPUTING AND APPLIED MATHEMATICS LABORATORY

computational, and analytical results in physics and chemistry. Researchers use a

collection of vector and raster workstations,

photographic and video hardware, highspeed networking for transmitting large

graphics data sets between computers and

graphics devices, and computational geometry algorithms and software for the analysis

of two- and three-dimensional data sets. Techniques also have been developed to manipulate dynamic objects in automated

design and manufacturing systems; to dis- play quasicrystal structures with icosahedral symmetries and scanning electron tunnel- ing microscopy data with polarization

analysis; and to study models of turbulent combustion showing the dependence of solutions on time and fuel-oxidizer mixture

parameters.

Contact: Howland Fowler

(301) 975-2703

email: howland@cam.nist.gov

B146 Technology Building

CONTINUAL UPGRADES

The laboratory maintains a central scientific computing environment for NIST staff

at Gaithersburg and Boulder. It procures and operates computer and communications facilities and maintains them at stateof-the-art levels suited to the needs of a highly diverse scientific and engineering

R&D community. The continuing program

of upgrading responds to advances in hardware, software, and communications technologies, as well as to changes in the kinds

of tools used in modern scientific research.

NIST specialists log and analyze the use

of the components of the facilities—hardware, software, operating systems, and net- works—to determine what changes or new

equipment will be most useful. They take

steps to acquire them where possible or to develop them internally. They design inter- faces as needed for users to gain access to the resources best suited to their needs. This work proceeds within a broad view of the

overall operation of the computing environ- ment and its interactions with external envi- ronments, as well as detailed understanding

of the progress of hardware and software

capabilities and of the roles of visualization and networking in the design and execution

of scientific computing projects.

Contact:

Eleazer Bromberg

(301) 975-3851

email: exb@cam.nist.gov

fax: (301) 963-9137 B118 Technology Building
INDEXES

FACILITIES INDEX SUBJECT INDEX automation, 39-40 Ceramics Division, 77-78

analytical chemistry, 6 ceramics, 76-79

Acoustic Anechoic Chamber, 45 acoustics computer technology, 110 composites, 84 Automated Manufacturing Research anechoic chamber, 45 data entry, IO6 dentures, 81

Facihty, 45 calibrations, 20 DNA sequencer, 11 machining, 6, 111 Cahbrated Hot Box, 100 emission, 82 electrical measurements, 27, 34 microstructure, 85, 89, 92

Cold Neutron Research Facihty, 88 laboratory accreditation, 18 electronics manufacturing, 23 powders, 7, 90-91 Computer and Network Security isolation, 38 intelligent processing, 38, 41, 76, 80 processing, 77, 90-91

Facihty, 107 phonetic locators, 106 in manufacturing, 6-7, 41, 43, 45, research grants, 8 Cryogenic Materials Laboratory, 91 thermo-, 54 111-112 superconductors, 32, 84-85

Electromagnetic Anechoic Chamber, 37 waves, 79 metal working equipment, 14 surface properties, 78

Electron Paramagnetic Resonance advanced materials (see materials) quality control, 39 testing, 50

Facility, 74 Advanced Systems Division, 105-106 welding, 80 thin films, 56

Fire Research Facilities, 100 Advanced Technology Program, 1, 2, 5, automotive, cover, 11, 39, 40, 80 chemical kinetics, 19, 24, 49, 55-56

Fluid Metering Research Facility', 6l 6, 10-12, 44 Chemical Kinetics and Ground Screen Antenna Range, 36 aerospace biotechnology, 47^9 Thermodynamics Division, 49-50

High-Accuraq' Ellipsometer, 35 alloys, 7, l6, 76 Advanced Technology Program, 1

1

Chemical Science and Technology

High-Resolution U\' and Optical engine components, 42, 57 biosensors, cover Laboratory, 46-62

Spectroscopy Facility, 73 equipment, 71 industry, 46, 48,51,53 chemical vapor deposition, 33, 56, 59, High-Voltage Measurement Facility, 34 industry, 25, 30, 58, 63, 85 reference data, 19 66. 72

Information Systems Engineering propulsion systems, 91 worbhops, 21 chromatography, 48, 51-52

Facility, 107 algorithms, 110 Biotechnology Division, 47-49 gas, 24, 34, 47, 52-53, 55 ISDN and Distributed Systems automation, 25, 40 Building and Fire Research Laboratory, ion, 50

Facility, 108 building controls, 96 4,93-101 liquid, 47, 52, 53, Large Environmental Chamber, 99 computational geometry, 112 building controls, 95-96, 99 supercritical, 59

Large-Scale Structures Testing computer networking, 105 Building Environment Division, 95-96 clocks, atomic, 63, 66

Facility, 98 modeling, 59, 97 building materials, 7, 98-99 clocks, high-performance, 71 Line Heat-Source Guarded Hot Plate, 100 parallel processing, 109 Building Materials Division, 94-95 coatings, 33, 39, 56, 78, 94 Low-Background Infrared Radiation quantum dynamics, 66

calibration services, 8, 16, 20

cold neutrons, 88-89

Facility, 74 ultrasonic sensor array, 79 analysis with, 50, 62, 85-86

Magnetic Microstructure Measurement video processing, 23 acoustics, 45 combustion

Facility, 75 alloys antennas, 35-37 chemical reactions, 66

Materials Science X-Ray Beamlines, 92 aerospace, 7, l6, 76 electrical resistance, 26 efficiency, 56-57

Metals Processing Laboratory, 89 atomic and molecular dynamics, 85 electromagnetic fields, 37 pollutants, 95, 101 Mode-Stirred Chambers, 36 electrical properties, 26 flow measurements, 54, 61 polymer, 4, 98

Near-Field Scanning Facility for lithium in, 62 force, 98 residential fires, 97 Antenna Measurements, 35 magnetic, 31, 83 heat flow, 100 thermodynamics, 49

Neutron Depth Profiling Facility, 62 polymer, 7, 82 infrared power, 74 turbulence, 112 NIST Research Reactor, 86 rapidly solidified, 90 ionizing radiation, 69-70 communications

Nitrogen Flow Measurement Facility, 6l in semiconductors, 27 microwave, 30 (see also telecommunications) Polymer Composite Fabrication Standard Reference Materials, 19 National Voluntary Laboratory computer, 105, 107-109, 112

Facility, 90 structure, 83, 85, 92 Accreditation Program, 18 industry, 11,25,30-31,85

Powder Characterization and Processing superconducting, 32 neutron devices, 89 optical, 78

Laboratory, 90 uranium, 84 optical electronics, 32 composites Radiopharmaceutical Standardization antennas, 6, 31-32, 35-37 pressure. 56 ceramic, 78, 84

Laboratory, 75 Applied and Computational Mathematics radiometry, 67 defects in, 79 Semiconductor Processing Research Division, 109-111 radiopharmaceuticals, 74 electromagnetic shielding, 36

Laboratory, 33 artificial intelligence, 94, 106 robots, 42 flammability, 98

Small-Angle X-Ray Scattering astrophysics, 72 spectrographic, 73 intelligent processing, 77

Facility, 92 atmospheric chemistry, 49, 66, 71, 94 Standard Reference Materials/Data, 19 metal, 84

Superconductor Integrated-Circuit atomic temperature, 56-57 polymer, 76, 80-82, 90

Fabrication Laboratory, 34 clocks, 63, 66 ultraviolet detectors, 64 properties of, 31,83, 99, 100 Synchrotron Ultraviolet Radiation fountain, 72 voltage, 25 radiation effects on, 74

Facility II, 73 motion control, 65 calorimetry, 49, 101 compositional mapping, 46, 57, 62, 91

Transistor Safe Operation Test physics, 91,63, 68 micro-, 30, 48, 69 compression, 23, 78, 91, 98, IO6

System, 34 -scale bonding, 85 catalysts, 48, 66, 68, 85 computer-aided design and

Transverse Electromagnetic Cells, 37 -scale measurements, 38 cement, 18, 94 (see also concrete) manufacturing, 6, 14, 1 12

Tri-Directional Test Facility, 99 spectroscopy, 50, 52 Center for Advanced Research in apparel, 43 Water Flow Measurement Facility, 6l structure, 65, 80 Biotechnology, 49 building construction, 96-97

theory, 65 microelectronics, 29 Atomic Physics Division, 64-65 systems engineering, 45 Automated Production Technology

Division, 39-40

I
INDEXES

computer graphics, cover, 109

biomolecules, 49 chemical kinetics, 56 data analysis, 111-112

fire research, 97, 101 NIST research reactor, 86, 88

optics measurements, 63

standards, 9, 103, 107 computer networks

accreditation, 18 high-speed, 112 management, 102, 104-106

security, 107-108

software depository, 1 1

computer security, 102-105, 107, 108

electronic bulletin board, 9 Computer Securit)' Division, 104-105 Computer 'Systems Laboratory, 102-108 Computing and Applied Mathematics

Laboratory, 109-112

concrete

accreditation, 18 corrosion of steel in, 83

recycled. 111 seismic safety, 93-94

structural testing, 98-99

concurrent engineering, 44

construction industry, 41, 43, 93-96, 99

Cooperative Research and Development

Agreements, 5, 8, l6, 18, 44, 84

corrosion, 55, 83, 85

cryogenic

current comparators, 26

electromagnetic properties, 31

electronics, 32

materials, 91-92

radiometry, 67-68, 74

refrigeration, 54

cryptography, 104-105, 108

crystal structures, 49, 78, 85-86, 92

databases management, 102-103, 107 NIST Gopher Information Service, 9

reference data, 19, 49, 56

testing, 102 data encryption, 104-105

dental materials, 74, 81 diamond films, 62 dimensional metrologv, 18, 20, 38-39, 43 DNA, 11,47-48, 111 dosimetry

ionizing radiation, 63, 69-70, 74

laboratory accreditation, 18 neutron, 86-88

synchrotron, 73

earthquake engineering, 93. 99

electrical laboratory accreditation, 18 metrology, 24 power equipment, 6, 11. 22, 71

properties of polymers, 81

standards, 22

Electricity Division, 23-27

Electromagnetic Fields Division, 30-31

electromagnetic radiation, 30-31

anechoic chamber, 37 antenna measurements, 36

calibration services, 20

compatibility, 18

emissions, 36-37

interference/noise, 24—25

laser trapping, 65

transducers, 82 wave modeling, 110 Electromagnetic Technology Division, 31-32

Electron and Optical Physics Division, 64-65

electronic bulletin boards, 1, 9, 17

electronic mail, 4, 13-14

electronics, 22-34, 63

(see also semiconductors) automated manufacturing of, 23

biomolecular, 48

devices, 79-80, 88

electromagnetic susceptibility, 36-37

gaseous, 24

materials, 24, 84

micro-, 11,30, 56,81-82

noise measurements, 71

opto-, 21-22, 24-25, 32

radiation processing of, 69

semiconductor, 27-30

superconducting, 54

Electronics and Electrical Engineering

Laboratory, 22-37

electrophoresis, 47-48, 50-51, 53

ellipsometry, 27-29, 35, 58, 83

energy, 46, 88

conservation, 99

efficiency, 18, 20, 95

meters, 32

production, 56, 58, 6l

radiation measurement, 70

recovery, chemical industry, 54

solar, 49

storage, 92

Energy-Related Inventions Program, 8, 20 environment

air pollution, 57,71,89, 94,98, 100

biosensors, 7, 48

chemical analysis, 46, 49-52, 58, 88 chemical waste destruction, 54

electrical insulation, 24

engineering, 93

monitoring, 29, 67, 70

radiation, 70

standards, 17

Factory Automation Systems Division, 43-44

Federal Laboratory Consortium, 18

fellowships, 72, 111

Fire Research Information Sen'ice, 96-97

Fire Safety Engineering Division, 96-97

Fire Science Division, 97-98

flat-panel displays, 7, 11, 22, 67

fluids flow measurement, 6, 54, 61-62

flow modeling, cover, 56, 97-98, 1 10 reference data, 19 thermophysical properties, 58-60

fracture mechanics, cover, 77-78, 84, 91-92, 94, 99

fullerenes, 85

gamma rays, 68, 69, 70, 75

gas metrology, 53-54

grants, 1,4-5, 8-9, 13-14, 19

guest researchers, 5, 8, l6, 18

hazard analysis, fire, 97 hazardous materials, destruction of, 55

heating, ventilation, and air conditioning (HVAC), 95-96, 99

high-definition television, 22-23

high-performance computing and

communications (HPCC), 109-111

high-temperature ceramics behavior, 78

gas-phase materials, 56, 84

reactors, 49

sensors, 57

X-ray analysis, 91-92

hypertext, 107

image processing, 23, 41, 47, 57, 69-70, 94, 106 image recognition, 102, 106 imaging

elemental distributions, 88

infrared, 67, 94

laser, 78

magnetic, 31. 83 magnetic resonance, 77, 91

ultraviolet, 64

X-ray scattering, 63, 92

indoor air quality, 95 Information Services, Office of, 20

Information Systems Engineering

Division, 9, 102-103

information systems technology, 102-108

Advanced Technology Program, 1

Automated Manufacturing Research

Facility. 45

construction industry, 96

engineering facility. 107 geographic data. 102

Integrated Services Digital Network

Facility^ 108 power electronics in, 28

infrared

detectors, 32, 54

flat-panel displays, 7

lasers, 53, 65

microscopy, 80

radiant power, 74

radiometry, 28, 66-68

sensors, 11, 40

spectrophotometer, 50, 69

spectroscopy, 27, 54, 71, 73, 91, 94

synchrotron research, 73

Inorganic Anahlical Research Division, 50

instrumentation, self-calibrating, 25

insulation, building, 18, 60, 95-96, 100

integrated circuits

(see also semiconductors)

dimensions, 38-39

microwave, 6, 30 Standard Reference Materials, 19 superconducting, 32, 34

Integrated Services Digital Network

(ISDN), 6, 9, 104-106, 108

intelligent building controls, 96 machine controls, 38, 41, 45

materials processing, 6-7, 76-77, 82-84

vehicles, 42

welding, 80

Intelligent Processing of Materials,

Office of, 77

interferometry, 38-40, 42, 65, 68, 72, 89

international standards, computers, 102-103, 108

construction, 96 ISO 9000, 16, 18 mechanical tolerances, 43

robots, 41 voluntary product, 16-17

international guest researchers, 5 International Organization of Legal Metrology (OIML), 17

Ionizing Radiation Division, 69-70

Joint Institute of Laboratory^

Astrophysics, 72 Journal ofResearch ofNIST. 9

lasers, 32

blue/green, 1

cooling and trapping, 65 Doppler velocimetry, 54, 6l

electrical metrology, 24

excitation, 28 imaging, 78

induced photochemistry, 69

infrared diode, 53

interferometry, 40, 42

lead salt, 68 magnetic resonance, 71

materials, 66

performance, 70

plasmas, 64

pulsed, 82 Raman microprobe, 57

scattering, 57

spectroscopy, 54, 65-66, 82, 84

stabilization, 72

temperature/pressure measurements, 56 thermal lens, 51 ultrasound, 77

ultraviolet, 49, 73

vapor deposition, 84

vision, 80

leak rate measurements, 33, 60

licenses, 8, l6, 18
INDEXES 115

lighting, 18, 63, 95

lithography. 73

electron beam, 34, 79

ion, 65

photo-, 7, 25, 32-33, 64

X-ray, 39. 63

machine intelhgence, 38. 41 machine tools. 11. 38. 40. -iS magnetic, 4, 22

devices, cooling of, 54

field meters, 34

flux, 26, 32

materials, 31-32, 83-84, 88, 110 measurements, 32

microstructures, 75, 85

multilayers, 86

properties, 85, 89

refrigeration, 84

resonance, 47^9, 71, 74, 81, 91

thin films, 58 Malcolm Baldrige National Quality Award, 1, 2, 7-8. 15 manufacturing Advanced Technology Program, 1

1

automation/engineering, 23, 38-45, 112 Manufacturing Extension Partnership, 13-14

materials processing, 76-77, 79-80, 82, 90-91 NIST mission, 2 process control, 54-57, 67-69, 73, 109

quality, 15, 24 R&D partnerships, 20-21

semiconductors, 28-30, 33, 56

success stories, 6-7

themioph>3ical properties, 58 Manufacturing Engineering Laboratory, 38-45

Manufacturing Extension Partnership,

1,2, 5-6, 8, 13-14

mass spectrometry, 49-50,54-55

accelerator, 58

biomolecules, 53 DNA damage, 47

gaseous, 24, 56 molecular beam, 84

secondary ion, 57

trace analysis, 52

materials advanced, 11,77, 83-85, 89

chemical composition, 62

corrosion of, 55

electromagnetic properties, 30

fabrication processes, 56, 60

grants, 8

high-temperature, 57

magnetic, 31-32, 75

optical properties, 67-68, 73

radiation effects, 74

stnicture, 68, 89, 92, 110

Materials Reliability Division, 79-80

Materials Science and Engineering

Laboratory, 4, 76-92

mathematics

applied and computational, 109-111

encr\'ption. 104

fractals, cover Guide to Available Software. 9 information services, 20 machine control, 41 modeling, 79-80, 83, 94-95, 97-98.

101. 109

tolerances, 43

medical, 46, 50, 53, 88

biomedical sensors, 7, 29, 48, 51

calibrations, 19

devices, 69

ionizing radiation, 63, 70, 74 magnetic storage, 31

materials, 81

radiopharmaceuticals, 75

metallurgy, 8

Metallurgy' Division, 82-84

metals. 76 (see also alloys) atomic structure, 68 chemical analysis of, 11, 50, 54, 62, 85, 88

dental, 81

electrical properties, 26 equipment, 14

glasses, 11 laboratory accreditation, 18 low-temperature properties, 91 mechanical properties, 84

microstructure, 89, 92

multilayers, 92

powders, 6, 7, 77

processing, 77, 79, 83, 90

sputtered, 29-30, 33, 55 Standard Reference Materials, 19

surfaces, 39

welding, 80

Metric Program, 21 microelectromechanical systems (MEMS), 29-30

microelectronics (see semiconductors) microscopy atomic force, cover

electron, 39, 57, 63, 75, 79, 84, 91-92, 94

infrared, 80

magnetic force, 31

optical, 33, 39 scanning tunneling, 38-39, 58, 72, 112 X-ray/extreme ultraviolet, 64 microwave, 22

antennas, 6, 31 atom traps, 65

calibration, 20, 30

detectors, 32

integrated circuits, 6, 30

laboratory equipment, 7

materials, 78

sources, 66

molecular

dynamics. 47, 49, 58, 66, 81, 85, 98, 110

kinetics, 73

physics. 19, 63, 68 molecular beam epita\7 (MBE), 27-28,

58, 72 Molecular Physics Division, 66-68

multimedia computer systems, 103, 106, 108

nanotechnology

composites, 83

devices, electron transport in, 66

fabrication, cover, 38, 65

metrology, integrated circuits, 29, 38

National Voluntary' Laboratory' Accreditation Program (N\1AP), 18, 70

neutron, 84-89 (see also cold neutrons)

activation analysis. 46-47, 50, 87

depth profiling, 62. Ill

diffraction, cover, 84-85

grants, 8

physics, 70, 89

radiography, 87

reflectometry, 86

scattering, 48, 58. 82, 85, 87-88

spectroscopy, 85

standards and dosimetry, 87-88

noise electrochemical, 83

electromagnetic, 25, 30, 74

electronics/optical systems, 71

in lasers, 72 mechanical, low-level. 46

trace analysis instrumentation, 53-54

non-destructive evaluation

electron paramagnetic resonance, 74 magnetic properties, 84

neutron methods, 62, 84-85, 87, 91, HI

radiation imaging, 69 semiconductor materials. 27-28, 34-35

sensors, 76-77

nuclear magnetic resonance, 47, 49, 81, 91

open systems, computers. 9. 102, 104, 107-108

Opportunities for Innovation, 20-21

optics/optical, 22, 38

aspheric metrology, 39

calibration, 20 camera, high-speed, 34

devices, 73

disk drives, 11,48, 106

electronics, 21-22, 24-25, 32

fibers, 74, 78, 82, 111

lasers, 70-71

materials characterization, 27-28, 35,

68, 73,81,84

microscopy, 33, 39

neutron, 89

noise measurements, 71

physics, 63-64

power, 67

scattering, 68

sensors, 24, 39,51,55-56

spectroscopy, 49-50, 65, 84

X-ray, 69

optimization, numerical, 110 Organic Analytical Research Division, 50-54

parallel computing, 23, 66, 102, 106, 109-111

patents, 8, 18, 45, 54

Physics Laboratory, 63-75

piezoelectric materials, 78, 81 plasmas

analytical chemistry. 50

diagnostics, 64, 73

electronics processing, 24, 64-65

low-temperature. 64-65

stripping, 33

polyTmers. 4. 80-82

chemical analysis, 62

in chromatography. 48

combustion, 98

composites, 80, 90

electrophoresis markers, 47, 51

fiber-reinforced, 11 grants, 8

interfaces, 86

materials processing, 7, 64, 69, 76-77

in membrane separation technology, 59

radiation effects, 74

structure, 68,81-82,85,89, 92 Polymers Division, 80-82

portability, computers, 103. 105

Precision Engineering Division. 38-39

pressure measurements, 56, 60-62

Process Measurements Division, 54-57

product data exchange using STEP

(PDES), 23, 43-44, 96 (see also STEP)

proteins, 47-49, 53, 59

protocols, computer, 96, 104-105, 107-108

publications, 9, 17, 19-20

Publications and Program Inquiries

Unit, 4, 8-9

pyrolysis, 55, 57

quality control, 6, l6, 19, 22

gases, 53 materials manufacturing, 60

radiation, ionizing, 70

semiconductors, 29

quality management, 7-8, 15 quantum

dynamics, 66

Hall effect, 26

metrology, 63

physics, 63, 72, 98

resonance, 72

wells, 27-28 Quantum Metrology Division, 68-69 Quantum Physics Division, 72
116 INDEXES

radiation, 66-70, 84-89

(see also radiometry)

dosimetry, 18, 63, 74

electromagnetic, 20, 31, 37

infrared, 74

ionizing, 20, 69-70, 84-89

ionizing effects, 47, 49 measurement, 66, 70

optical 20, 67

physics, 63

shielding, 81

synchrotron, 27, 63, 73, 87

thermal, 97

Radiometric Physics Division, 66-68

radiometry, 66-68

cryogenic, 67, 74

flat-panel display, 23

infrared, 28, 67-68

thermal, 67

ultraviolet, 7, 64, 67, 73

radiophamiaceuticals, 19, 75

Reactor Radiation Division, 84-86

reference materials

(see Standard Reference Materials)

refrigerants, 60, 66, 95

refrigeration, 26, 54, 74, 84, 95 Research and Technology Application,

Office of, 18

resistance standards, 26-27

robots, 6, 14,41-43,45,51, 110 Robot Systems Division, 41-43

satellites, 13-14,31,54, 69,71, 103

Scientific Computing Environments

Division, 111-112

scientific visualization, 111-112

Semiconductor Electronics Division, 27-30

semiconductors, 22, 27-30

(see also integrated circuits) atomic structure, 68

cleaning surface of, 1

devices, 28

ion implantation, 26

lithography, 7, 64 manufacturing productivity, 6

materials, 27-28, 32, 35, 50, 62, 66, 72, 74, 85, 89. 92 packaging materials, 81-82

processing, 29-30, 33, 56, 59, 64-65

testing, 24-25, 29

sensors, 11, 21, 29

bio-, cover, 7, 11, 48, 51 chemical, 46, 55 machining, 43

magnetic, 31 manufacturing, 45, 76

optical, 24, 32,34,41,49,55

pressure, 62

processing, 30, 38, 41, 59, 77, 82-83

radiation, 69

temperature, 4, 57, 111

ultrasonic, 79

welding, 80

separations chemical, 51-52, 59, 82

proteins, 48

small business, 6, 8, 13-15, 20-21

Small Business Innovation Research Program, 8,21 smoke, 7, 97-98, 100-101

software, computer, 103

interactive, 103 manufacturing, 14, 38, 43-45

standards, 9, 102, 107

soils, 51,83

spectroscopy, 80, 82, 84

atomic, 50, 73

deep-level transient, 27

electron, 58, 68, 73 energy loss, 82, 87

fellowships, 72

fluorescence, 77, 82

infrared, 27,54,71,73,91,94

ion scattering, 58

kinetic absorption, 49

laser, 54, 65 magnetic materials, 88

molecular, 66, 73

neutron, 8, 85

nuclear magnetic resonance, 47, 49, 81

optical, 73 photo correlation, 90

positron annihilation, 81 Raman, 48, 91 REMP1,49

semiconductor, 28

surface, 55

uv-visible, 82

X-ray, 58, 68

speech recognition, 106 Standard for the Exchange of Product Model Data (STEP), 9, 43-44, 96

Standard Reference Data, 8-9, l6, 19, 46

Standard Reference Materials, 7-8, 16, 19 analytical chemistry, 46, 50, 53, 62, 88

electromagnetic, 30

optical scatter, 68

proteins, 47, 53

radiopharmaceuticals, 75

semiconductors, 29, 35, 39

superconductors, 32 thermal insulation, 95 thermodynamics. 49

Standards Analysis and Assistance, 16-17

Standards Information Center, 17 Standards Management, 17

State Technology Extension Program, 13-14

Statistical Engineering Division, 111

statistics, 110

dental materials, 81

equilibrium, 24 measurement quality, 19, 37, 58, 109, 111 molecular models, 58

tolerances, 43

steel, 6 coatings for, 94

corrosion, 83

fracture properties, 99 magnetic properties, 31 manufacturing, 76-77, 79

nitrogen in, 62 Standard Reference Materials, 19

stress in, 84

structural testing, 98-99

Structures Division, 93-94

success stories, 6-7, 30 supercomputers, 7, 23, 49, 107-110

superconductors, 76

characterization, 66

fabrication of, 34

high-temperature, 11, 26, 32, 78, 83-85

layers, 86

low-temperature, 32 magnetic, 58. 65,88,91

refrigeration of, 54

texture, 84

supercritical fluids, 51-52, 55, 59

surfaces ceramics, properties of, 77-78

chemistry, 56-57, 73, 91

of liquids, 89 magnetism, 75 melting of alloys, 90

optical scatter, 68

roughness, 39

science, 54

spectroscopy, 55

thin films, properties of, 86

Surface and Microanalysis Science

Division, 57-58

synchrotron radiation research, 27, 63-64, 68, 73. 78, 92 Systems and Network Architecture

Division, 105 Systems and Software Technology

Division, 103

Technologv at a Glance, 9 Technology Development and Small

Business Program, 5, 18-19

Technology Evaluation and Assessment,

Office of, 20 Technology Services, 16-21

technology transfer, 7-8, 13-14, 18-19,29, 44

telecommunications, 18, 71, 102, 104-105, 107-108

(see also communications)

temperature measurements, 56-57, 99, 101 thermal resistance, 100 thermochemistry, 19, 49

thermodynamics,

bio-, 48

calibration services, 20

chemical, 49, 56

fluids, 58

laboratory accreditation, 18 phase equilibria, 83

Thermophysics Division, 58-61

thin films, 84, 89

ceramic, 56

electromagnetic properties of, 31

filters, 64

magnetic, 58, 75 mechanical properties, 79

multilayers, 69, 86

semiconductor, 29-30, 33, 56, 72, 82

sensors, 55

superconducting, 32, 34

surfaces, 86

time and frequency, 63. 70-71

calibration services, 20

high-speed detectors, 32

laboratory accreditation, 18

transfer, 71 Time and Frequency Division, 70-71

transducers, 45, 56, 60, 79, 82

transportation industry, 28, 42, 91, 97

ultrasound, 11,20, 77, 79, 82

ultraviolet

laser, 49, 65

optics, 64

radiometry, 7, 64, 66-67

scattering. 68

spectrophotometer, 50, 69

spectroscopy, 55, 73, 82

synchrotron radiation, 73

vacuum standards, 60

video processing, 11, 22-23. 42, 106

voltage

high-, 24, 34, 68

measurements, 26 semiconductor analysis, 31

standards, 24-25, 32

voluntary product standards, 16-18

antennas, 31

buildings and fire, 93-95

computet^, 103-104, 106

Weights and Measures Program, 9. 17. 21 welding, 6, 77, 80, 84 wind engineering, 93-94, 99

X-rays

absorption. 90. 92

crystallography. 49

diffraction. 81,91

fluorescence,50 imaging, 63, 94

lithography, 39, 63

materials characterization, 27, 94

optics, 64, 69, 73

sensors, 11 small-angle scattering, 92

sources, 69-70

spectroscopy, 55, 58, 65. 68

topography, 78
l .S. DEPARTMENT OF COMMERCE

Ronald H. Brown. Secretary

Mary L. Good, Under Secretary for Technology

National Institute of Standards and Technology

Arati Prabhakar, Director

National Institute of Standards and Technology

Gaithersburg, Md. 20899-0001

(301) 975-2000

Boulder. Colo. 80303-3328

(305) 497-3000

October 1993

NIST Special Publication 858

Prepared by the Public Affairs Division

SP 858 Staff Project Manager: Sharon A. Shaffer

Editor: Gail Porter

Production: Virginia M. Covahey, Sheila D. St. Clair

Graphic Design: Cinda Debbink

Photographer: H. Mark Heifer

Printing Coordination: Warren Overman

Public Affairs Division

A903 Administration Building

National Institute of Standards and Technology

Gaithersburg, Md. 20899-0001

(301) 975-2762

Any mention of commercial

products is for information only; it does not imply recommendation or endorsement by the National

Institute of Standards and

Technology nor does it imply that the products mentioned are

necessarily the best available for

the purpose.

4