[Federal Register Volume 88, Number 175 (Tuesday, September 12, 2023)]
[Notices]
[Pages 62553-62554]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2023-19596]


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DEPARTMENT OF DEFENSE

Department of the Air Force

[ARY-230418B-JA]


Notice of Intent To Grant a Joint Ownership Agreement With an 
Exclusive Patent License

AGENCY: Department of the Air Force, Department of Defense.

ACTION: Notice of intent.

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SUMMARY: Pursuant to the Bayh-Dole Act and implementing regulations, 
the Department of the Air Force hereby gives notice of its intent to 
grant a joint ownership agreement with an Exclusive Patent License to 
Licensee, Battelle Memorial Institute having a place of business at 505 
King Avenue, Columbus, Ohio 43201.

DATES: Written objections must be filed no later than fifteen (15) 
calendar days after the date of publication of this Notice.

[[Page 62554]]


ADDRESSES: Submit written objections to Dr. Griffin Romigh, Lead, 
Office of Research and Technology Applications (ORTA), AFRL/RY--Sensors 
Directorate, Bldg. 600, 2nd Floor, 2241 Avionics Circle, Wright-
Patterson AFB, OH 45433; Phone (937) 713-3494; or Email: 
<a href="/cdn-cgi/l/email-protection#b5d2c7dcd3d3dcdb9bc7dad8dcd2ddf5c0c69bd4d39bd8dcd9"><span class="__cf_email__" data-cfemail="abccd9c2cdcdc2c585d9c4c6c2ccc3ebded885cacd85c6c2c7">[email protected]</span></a>. Include Docket No. ARY-230418B-JA in the 
subject line of the message.

FOR FURTHER INFORMATION CONTACT: Dr. Griffin Romigh, Lead, Office of 
Research and Technology Applications (ORTA), AFRL/RY--Sensors 
Directorate, Bldg. 600, 2nd Floor, 2241 Avionics Circle, Wright-
Patterson AFB, OH 45433; Phone (937) 713-3494; or Email: 
<a href="/cdn-cgi/l/email-protection#1473667d72727d7a3a667b797d737c5461673a75723a797d78"><span class="__cf_email__" data-cfemail="c7a0b5aea1a1aea9e9b5a8aaaea0af87b2b4e9a6a1e9aaaeab">[email protected]</span></a>.
    Abstract of patent application(s): An integrated circuit (IC) 
validation method consisting of means to acquire an image of an IC 
under test by scanning an optical beam over the IC under test to 
optically inject carriers into the IC under test and measuring an 
output signal generated by the IC under test in response to the optical 
carrier injection (e.g., Two-photon Optical Beam Induced Current--
TOBIC); computing a comparison image between the image of the IC under 
test and a reference image; and identifying suspect regions of the IC 
under test based on the computed difference image.
    Intellectual property: U.S. Application Serial No. 63/343,204, 
filed on May 18, 2022 entitled ``Non-Destructive Verification of 
Integrated Circuits''.
    The Department of the Air Force may grant the prospective license 
unless a timely objection is received that sufficiently shows the grant 
of the license would be inconsistent with the Bayh-Dole Act or 
implementing regulations. A competing application for a patent license 
agreement, completed in compliance with 37 CFR 404.8 and received by 
the Air Force within the period for timely objections, will be treated 
as an objection and may be considered as an alternative to the proposed 
license.
    Authority: 35 U.S.C. 209; 37 CFR 404.

Mia Day,
Acting Air Force Federal Register Liaison Officer.
[FR Doc. 2023-19596 Filed 9-11-23; 8:45 am]
BILLING CODE 5001-10-P


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