# Patent

## Title
Storage device testing system cooling

## Abstract

A storage device transporter includes a transporter body having first and second body portions. The first body portion is configured to be engaged by automated machinery for manipulation of the storage device transporter. The second body portion is configured to receive and support a storage device. The first body portion is configured to receive and direct an air flow over one or more surfaces of a storage device supported in the second body portion.

## Background
CROSS REFERENCE TO RELATED APPLICATIONS
This U.S. patent application is a continuation-in-part of, and claims priority under 35 U.S.C. §120 from, U.S. patent application Ser. No. 12/698,575, filed on Feb. 2, 2010. This application is a continuation-in-part of, and claims priority under 35 U.S.C. §120 from, U.S. application Ser. No. 12/503,567, filed Jul. 15, 2009 now U.S. Pat. No. 7,920,380, now pending. The disclosures of both of these prior applications is considered part of the disclosure of this application and are incorporated herein by reference in their entirety.


TECHNICAL FIELD
This disclosure relates to cooling in storage device testing systems.
BACKGROUND
Storage device manufacturers typically test manufactured storage devices for compliance with a collection of requirements. Test equipment and techniques exist for testing large numbers of storage devices serially or in parallel. Manufacturers tend to test large numbers of storage devices simultaneously. Storage device testing systems typically include one or more racks having multiple test slots that receive storage devices for testing.
During the manufacture of disk drives or other storage devices, it is common to control the temperature of the storage devices, e.g., to ensure that the storage devices are functional over a predetermined temperature range. For this reason, the testing environment immediately around the storage devices can be varied under program control. In some known testing systems, sometimes called “batch testers,” the temperature of plural storage devices is adjusted by using cooling or heating air which is common to all of the storage devices.
Batch testers generally require all storage device tests to be at substantially the same temperature, and require all storage devices to be inserted or removed from the test system at substantially the same time. Storage devices generally vary substantially in both the time required to test them and the amount of time that each test requires a particular ambient temperature. Because of these variations, batch testers tend to inefficiently use available testing capacity. There are also known testing systems that allow separate control of the insertion, removal, and temperature of each storage device. These test systems tend to more efficiently use the available testing capacity, but require duplication of temperature control components across every test slot, or sharing of those components among a small number of test slots.
Some storage device test systems use heated or cooled air to heat or cool the storage device. For separate thermal control of each storage device, a separate closed-loop air flow is sometimes used, with heaters or coolers disposed in the air flow. In some examples, the storage device is allowed to self-heat, and thus only a cooler is used. Heating may also be enhanced by reducing or otherwise controlling the flow of the air, and cooling may also be enhanced by increasing the air flow. In some examples of separate thermal control of each storage device, air is drawn from ambient air outside of the tester, rather than through a cooler that draws heat from a closed loop air flow.
Disadvantages of systems with separate thermal controls for each test slot include the need for many separate thermal control components for each test slot (e.g., heaters, coolers, fans, and/or controllable baffles). In addition, efficient use of energy generally requires each test slot to have a closed loop air flow system during at least some of the operating time. A closed loop air flow system typically requires ducting for the air to flow in both directions, to complete a loop, which requires additional space for the air return path. In addition, coolers may create condensation when operating below the dew point of the air. The formation of condensation may be avoided at the cost of reduced cooling performance, by limiting the coolant temperature. Alternatively, the formation of condensation may be avoided controlling and/or removing the moisture content in the air.
SUMMARY
The present disclosure provides a storage device testing system that reduces the number of temperature control components generally required, while still allowing separate control of the temperature of each test slot, thus achieving greater test slot density and lower cost. The storage device testing system provides separate thermal control for each storage device test slot, with relatively fewer thermal control components, and without a separate closed loop air flow path for each test slot. The thermal control for a storage device testing system results in substantially no condensation forming in or near the test slot, without having to manage the moisture content of the air. The storage device testing system uses a common reservoir of cooled air, which is cooled by relatively few heat exchangers. Condensation formed on the heat exchangers is concentrated in relatively few locations and may be removed by conventional methods, such as evaporators or drains. Alternatively, the heat exchangers may be controlled to operate above the dew point. Air from the common reservoir is drawn though each test slot using a separate controllable air mover for each test slot. The amount of cooling may be controlled by the speed of the air mover. To heat a storage device received in a test slot, a heater may be placed in an inlet air path to the test slot, a direct contact heater may be placed on the received storage device, or the storage device may be allowed to self heat by reducing or shutting off the air flow through the test slot. In some implementations, the reservoir of cooled air is formed by the shape of the storage device testing system, rather than by a separate enclosure. The cooling air may also be used to cool other electronics disposed with in the storage device testing system.
One aspect of the disclosure provides a storage device transporter that includes a transporter body having first and second body portions. The first body portion is configured to be engaged by automated machinery for manipulation of the storage device transporter. The second body portion is configured to receive and support a storage device. The first body portion is configured to receive and direct an air flow over one or more surfaces of a storage device supported in the second body portion.
Implementations of the disclosure may include one or more of the following features.
In some implementations, the first body portion includes an air director having one or more air entrances for receiving air into the first body portion and directing air into the second body portion. The one or more air entrances can be configured to be engaged by automated machinery for manipulation of the storage device transporter.
In some examples, the second body portion includes first and second sidewalls arranged to receive a storage device therebetween.
In some cases, the first body portion can include one or more vision fiducials.
The storage device transporter can include a clamping mechanism that is operable to clamp a storage device within the second body portion.
In some implementations, the first body portion is configured to direct air over top and bottom surfaces of a storage device supported in the second body portion.
In certain implementations, the first body portion can include an air director having one or more air entrances for receiving air into the first body portion and directing air into the second body portion. The one or more air entrances can be arranged to register the storage device transporter in X, Y, and rotational directions when the storage device transporter is engaged by automated machinery.
In some examples, the second body portion defines a substantially U-shaped opening which allows air to flow over a bottom surface of a storage device supported in the storage device transporter.
Another aspect of the disclosure provides a test slot assembly that includes a storage device transporter and a test slot. The storage device transporter includes a transporter body having first and second body portions. The first body portion is configured to be engaged by automated machinery for manipulation of the storage device transporter, and the second body portion is configured to receive and support a storage device. The first body portion is configured to receive and direct an air flow over one or more surfaces of a storage device supported in the second body portion. The test slot includes a housing. The housing defines a test compartment for receiving and supporting the storage device transporter, and an open end that provides access to the test compartment for insertion and removal of the disk drive transporter.
Implementations of the disclosure may include one or more of the following features. In some implementations, the storage device transporter is completely removable from the test compartment.
In certain implementations, the storage device transporter is connected to the test slot in such a manner as to form a drawer for receiving a storage device.
Another aspect of the disclosure provides a storage device testing system that includes automated machinery and a storage device transporter. The storage device transporter includes a transporter body having first and second body portions. The first body portion is configured to be engaged by automated machinery for manipulation of the storage device transporter. The second body portion is configured to receive and support a storage device. The first body portion is configured to receive and direct an air flow over one or more surfaces of a storage device supported in the second body portion.
Implementations of the disclosure may include one or more of the following features.
In some implementations, the first body portion includes an air director having one or more air entrances for receiving air into the first body portion and directing air into the second body portion, and the one or more air entrances are configured to be engaged by the automated machinery for manipulation of the storage device transporter.
In certain implementations, the automated machinery includes a mechanical actuator adapted to engage the one or more air entrances.
In some implementations, the first body portion includes one or more vision fiducials, and the automated machinery includes an optical system for detecting the vision fiducials.
In certain implementations, the automated machinery includes posts and the first body portion includes one or more air entrances for receiving air into the first body portion and directing air into the second body portion. The air entrances are arranged to be engaged by the posts to register the storage device transporter in X, Y, and rotational directions when the storage device transporter is engaged by the automated machinery.
In some implementations, the first body portion includes a pair of slots, and the automated machinery includes a pair of claws operable to engage the slots.
In certain implementations, the storage device testing system includes a clamping mechanism that is operable to clamp a storage device within the second body portion. The automated machinery is operable to actuate the clamping mechanism.
In some implementations, the automated machinery includes a robotic arm and a manipulator attached to the robotic arm. The manipulator is configured to engage the storage device transporter.
The details of one or more implementations of the disclosure are set forth in the accompanying drawings and the description below. Other features, objects, and advantages will be apparent from the description and drawings, and from the claims.



DESCRIPTION OF DRAWINGS
FIG. 1 is a perspective view of a storage device testing system having racks arranged in a substantially circular configuration.
FIG. 2 is a top view of the storage device testing system shown in FIG. 1.
FIG. 3 is a perspective view of a storage device testing system and a transfer station.
FIG. 4 is a perspective view of a manipulator.
FIG. 5A is a side perspective view of a storage device transporter.
FIG. 5B is a front perspective views of the storage device transporter shown in FIG. 4A.
FIG. 5C is a bottom perspective views of a storage device transporter carrying a storage device.
FIG. 5D is a side perspective view of a storage device transporter receiving a storage device.
FIG. 5E is perspective view of a front panel of the storage device transporter.
FIGS. 6A and 6B are perspective views of a rack receiving a test slot carrier holding test slots.
FIG. 7A is a perspective views of a test slot carrier holding test slots, one of which is receiving a storage device transporter carrying a storage device.
FIG. 7B is a rear perspective views of the test slot carrier of FIG. 7A.
FIG. 7C is a sectional view of a test slot carrier along line 6C-6C in FIG. 6A.
FIGS. 8A and 8B are perspective views of a test slot receiving a storage device transporter carrying a storage device.
FIG. 8C is a rear perspective view of a test slot.
FIG. 9 is a perspective view of an air mover.
FIGS. 10A and 10B are perspective views of a rack of a storage device testing system showing an air flow path through the rack and test slots housed by the rack.
FIG. 11A is an exploded perspective view of a test slot assembly including a storage device transporter.
FIG. 11B is a perspective view of the test slot assembly of FIG. 11A including a storage device transporter in the form of a drawer assembled with a test slot.
FIGS. 12A and 12B are perspective views of a storage device transporter carrying a storage device being received inserted into a test slot of a storage device testing system.
FIG. 13 is a sectional view of a test slot along line 13-13 in FIG. 12A.
FIG. 14 is a side perspective view of a storage device transporter.
FIG. 15 is a front perspective view of a storage device transporter.
FIG. 16 is a bottom perspective view of a storage device transporter.
FIG. 17 is a perspective view of a storage device transporter receiving a storage device.
FIG. 18 is a perspective view of a test slot and a test slot cooling system in a rack of a storage device testing system.
FIG. 19 is a perspective view of an air cooler.
FIG. 20 is a perspective view of an air mover.
FIG. 21 is a top view of a test slot and a test slot cooling system in a rack of a storage device testing system showing an air flow path through the test slot and a test slot cooling system.
FIG. 22 is a side sectional view of a test slot showing an air flow path over the top and bottom surfaces of a storage device received in the test slot.



Like reference symbols in the various drawings indicate like elements.
DETAILED DESCRIPTION
Temperature regulation of a storage device can be an important factor during testing (e.g., validation, qualification, functional testing, etc.) of a storage device. One method of performing temperature regulation includes moving air over and/or about the storage device during testing. As will be discussed in detail, the volume, temperature, and flow path of the air moved with respect to the storage device during testing, inter alia, can each be factors in providing reliable, effective, and efficient temperature control of the storage device.
A storage device, as used herein, includes disk drives, solid state drives, memory devices, and any device that benefits from asynchronous testing for validation. A disk drive is generally a non-volatile storage device which stores digitally encoded data on rapidly rotating platters with magnetic surfaces. A solid-state drive (SSD) is a data storage device that uses solid-state memory to store persistent data. An SSD using SRAM or DRAM (instead of flash memory) is often called a RAM-drive. The term solid-state generally distinguishes solid-state electronics from electromechanical devices.
Referring to FIGS. 1-3, in some implementations, a storage device testing system 100 includes at least one automated transporter 200 (e.g. robot, robotic arm, gantry system, or multi-axis linear actuator) defining a first axis 205 (see FIG. 3) substantially normal to a floor surface 10. In the examples shown, the automated transporter 200 comprises a robotic arm 200 operable to rotate through a predetermined arc about the first axis 205 and to extend radially from the first axis 205. The robotic arm 200 is operable to rotate approximately 360° about the first axis 205 and includes a manipulator 210 disposed at a distal end 202 of the robotic arm 200 to handle one or more storage devices 500 and/or storage device transporters 800 to carry the storage devices 500 (see e.g., FIGS. 5A-5E). Multiple racks 300 are arranged around the robotic arm 200 for servicing by the robotic arm 200. Each rack 300 houses multiple test slots 330 configured to receive storage devices 500 for testing. The robotic arm 200 defines a substantially cylindrical working envelope volume 220, with the racks 300 being arranged within the working envelope 220 for accessibility of each test slot 330 for servicing by the robotic arm 200. The substantially cylindrical working envelope volume 220 provides a compact footprint and is generally only limited in capacity by height constraints. In some examples, the robotic arm 200 is elevated by and supported on a pedestal or lift 250 on the floor surface 10. The pedestal or lift 250 increases the size of the working envelope volume 220 by allowing the robotic arm 200 to reach not only upwardly, but also downwardly to service test slots 330. The size of the working envelope volume 220 can be further increased by adding a vertical actuator to the pedestal or lift 250. A controller 400 (e.g., computing device) communicates with each automated transporter 200 and rack 300. The controller 400 coordinates servicing of the test slots 330 by the automated transporter(s) 200.
The robotic arm 200 is configured to independently service each test slot 330 to provide a continuous flow of storage devices 500 through the testing system 100. A continuous flow of individual storage devices 500 through the testing system 100 allows varying start and stop times for each storage device 500, whereas other systems that require batches of storage devices 500 to be run all at once as an entire testing load must all have the same start and end times. Therefore, with continuous flow, storage devices 500 of different capacities can be run at the same time and serviced (loaded/unloaded) as needed.
Referring to FIGS. 1-3, the storage device testing system 100 includes a transfer station 600 configured for bulk feeding of storage devices 500 to the robotic arm 200. The robotic arm 200 independently services each test slot 330 by transferring a storage device 500 between the transfer station 600 and the test slot 330. The transfer station 600 houses one or more totes 700 carrying multiple storage devices 500 presented for servicing by the robotic arm 200. The transfer station 600 is a service point for delivering and retrieving storage devices 500 to and from the storage device testing system 100. The totes 700 allow an operator to deliver and retrieve a collection of storage devices 500 to and from the transfer station 600. In the example shown in FIG. 3, each tote 700 is accessible from respective tote presentation support systems 720 in a presentation position and may be designated as a source tote 700 for supplying a collection of storage devices 500 for testing or as a destination tote 700 for receiving tested storage devices 500 (or both). Destination totes 700 may be classified as “passed return totes” or “failed return totes” for receiving respective storage devices 500 that have either passed or failed a functionality test, respectively.
In implementations that employ storage device transporters 800 (FIGS. 5A-5E) for manipulating storage devices 500, the robotic arm 200 is configured to remove a storage device transporter 800 from one of the test slots 330 with the manipulator 210, then pick up a storage device 500 from one the totes 700 presented at the transfer station 600 or other presentation system (e.g., conveyor, loading/unloading station, etc.) with the storage device transporter 800, and then return the storage device transporter 800, with a storage device 500 therein, to the test slot 330 for testing of the storage device 500. After testing, the robotic arm 200 retrieves the tested storage device 500 from the test slot 330, by removing the storage device transporter 800 carrying the tested storage device 500 from the test slot 330 (i.e., with the manipulator 210), carrying the tested storage device 500 in the storage device transporter 800 to the transfer station 600, and manipulating the storage device transporter 800 to return the tested storage device 500 to one of the totes 700 at the transfer station 600 or other system (e.g., conveyor, loading/unloading station, etc.).
Referring to FIG. 4, the manipulator 210 may include an optical system 212 and a mechanical actuator 240. The optical system 212 may include a camera 220 and a light source 230. A storage device 500 may be carried by the storage device transporter 800 (FIGS. 5A-5E) that is gripped by the manipulator 210 via the mechanical actuator 240.
As illustrated in FIGS. 5A-5E, the storage device transporter 800 includes a transporter body 810 having first and second portions 802, 804. The first portion 802 of the transporter body 810 includes a manipulation feature 812 (e.g., indention, protrusion, aperture, etc.) configured to receive or otherwise be engaged by the manipulator 210 for transporting. The second portion 804 of the transporter body 810 is configured to receive a storage device 500. In some examples, the second transporter body portion 804 defines a substantially U-shaped opening 820 formed by first and second sidewalls 822, 824 and a base plate 826 of the transporter body 810. The storage device 500 is received in the U-shaped opening 820. FIGS. 5C-5D illustrate an exemplary storage device 500 that includes a housing 510 having top, bottom, front, rear, left and right surfaces 512, 514, 516, 518, 520, 522. The U-shaped opening 820 allows air moving through the test sot 330 to flow over the bottom surface 514 of the storage device 500. The storage device 500 is typically received with its rear surface 518 substantially facing the first portion 802 of the storage device transporter body 810. The first portion 802 of the transporter body 810 includes an air director 830 (front panel) that receives and directs air substantially simultaneously (e.g., in parallel) over at least the top and bottom surfaces 512, 514 of the storage device 500 received in the storage device transporter 800. The air director 830 defines one or more air entrances 832a-c (e.g., aperture(s), slot(s), etc.) for receiving air into the first portion 802 of the transporter body 810 and directing it out into the second portion 804 of the transporter body 800, such that the air can move over at least the top and bottom surfaces 512, 514 of the received storage device 500. In some implementations, the air director 830 includes a guide (e.g., diverter, fin, plenum, etc.) for guiding the air over the received storage device 500.
Referring to FIG. 5A, there is seemingly no area left to include an additional mechanical protrusion or cavity for a gripper 242 (FIG. 4) of the mechanical actuator 240 to engage. But, by designing the gripper 242, such as illustrated in FIG. 4, such that it exploits cavities, rather than protrusions, it is possible to combine the functionality of the air entrances with the gripper 242 of the mechanical actuator 240. In this example, (shown in close up in FIG. 5E), the gripper 242 can engage with the center rectangular cutout 832a and with the two round holes 832b, allowing the air entrances to serve also as engagement features.
The round holes 832a allow posts 244 on the gripper 242 to register the storage device transporter 800 in the X and Y dimensions, as well as rotationally since multiple holes are used for registration. The rectangular cutout 832a contains internal slots 834 for claws 246a, 246b of the gripper 242 to engage and pull the storage device transporter 800 to a registration point on the face of the gripper 242 in the Z dimension.
As illustrated in FIGS. 5A and 5C, sufficient area remains for mechanical rigidity and to place two fiducial marks 836 for the optical system 212 (FIG. 3) to detect. Alternatively or additionally, the air entrances 832a-c themselves may be used as vision fiducials.
In some examples, the storage device transporter 800 includes a heater 860 that either provides conductive heating by direct contact with a received storage device 500 or convective heating by heating air flowing into and/or over the storage device transporter 800 and the received storage device 500. A detailed description of the heater 860 and other details and features combinable with those described herein may be found in the following U.S. patent application Ser. No. 12/503,593, filed on Jul. 15, 2009, the entire contents of which are hereby incorporated by reference.
Some storage devices 500 can be sensitive to vibrations. Fitting multiple storage devices 500 in a single test rack 330 and running the storage devices 500 (e.g., during testing), as well as the insertion and removal of the storage device transporters 800, each optionally carrying a storage device 500, from the various test slots 330 in the test rack 300 can be sources of undesirable vibration. In some cases, for example, one of the storage devices 500 may be operating under test within one of the test slots 330, while others are being removed and inserted into adjacent test slots 330 in the same rack 300. Clamping the storage device transporter 800 to the test slot 330 after the storage device transporter 800 is fully inserted into the test slot 330 can help to reduce or limit vibrations by limiting the contact and scraping between the storage device transporters 800 and the test slots 330 during insertion and removal of the storage device transporters 800.
In some implementations, the manipulator 210 is configured to initiate actuation of a clamping mechanism 840 disposed in the storage device transporter 800. This allows actuation of the clamping mechanism 840 before the storage device transporter 800 is moved to and from the test slot 330 to inhibit movement of the storage device 500 relative to the storage device transporter 800 during the move. Prior to insertion in the test slot 330, the manipulator 210 can again actuate the clamping mechanism 840 to release the storage device 500 within the transporter body 800. This allows for insertion of the storage device transporter 800 into one of the test slots 330, until the storage device 500 is in a test position engaged with the test slot 330 (e.g., a storage device connector 532 (e.g., electrical connector) of the storage device 500 (FIG. 7C) is engaged with a test slot connector 392 (FIG. 7C) (e.g., electrical connector) of the test slot 330). The clamping mechanism 840 may also be configured to engage the test slot 330, once received therein, to inhibit movement of the storage device transporter 800 relative to the test slot 330. In such implementations, once the storage device 500 is in the test position, the clamping mechanism 840 is engaged again (e.g., by the manipulator 210) to inhibit movement of the storage device transporter 800 relative to the test slot 330. The clamping of the storage device transporter 800 in this manner can help to reduce vibrations during testing. In some examples, after insertion, the storage device transporter 800 and storage device 500 carried therein are both clamped or secured in combination or individually within the test slot 330. A detailed description of the storage device transporter 800 and other details and features combinable with those described herein may be found in U.S. patent application Ser. No. 12/503,687, filed on Jul. 15, 2009, and in U.S. patent application Ser. No. 12/503,567, filed on Jul. 15, 2009. These applications are hereby incorporated by reference in their entireties.
In the examples illustrated in FIGS. 6A and 6B, each rack 300 includes one or more carrier receptacles 310 each configured to receive a test slot carrier 320 that carries one or more test slots 330. The test slot carrier 320 provides a collection of test slots 330 that allows for bulk loading of test slots 330 into a rack 300. The rack 300 can be quickly serviced to change out different types of test slots 330 by removing one test slot carrier 320 having one type of test slots 330 from its respective carrier receptacle 310 and loading another carrier 320 having a different type or assortment of test slots 330 without having to modify the rack 300 to accommodate a particular mounting spacing for each type of test slot 330. Some carrier receptacles 310 may have a common standard size for receiving complementary standard sized test slot carriers 320. The number of test slot receptacles 324 any particular test slot carrier 320 carries may vary depending upon the type(s) of test slots 330 received therein. For example, a test slot carrier 320 will accommodate fewer relatively larger test slots 330 four receiving relatively larger storage devices 500 as compared to relatively smaller (thinner) test slots 300 for relatively smaller storage devices 500.
Each rack 300 includes an air conduit 304 (also shown in FIGS. 10A and 10B) that provides pneumatic communication between each test slot 330 of the respective rack 300 and an exit 353 of the rack 300. In some implementations, the air conduit 304 is formed by a space between the test slots 330 and a rear wall 303 of the rack 300. The air conduit 304 can also be attached to an exterior of the rack 300, such as the wedge shaped conduit 304 shown in FIG. 6B. In some implementations, as shown in FIG. 3, the air conduit 304 is in pneumatic communication with a system air mover 190 (e.g., via a common system air conduit 345) and/or air exterior to the rack 300, for moving air between the rack 300 and the environment around the rack 300. In this case, the system air mover 190 can be pneumatically connected to every air conduit 304 in the storage device testing system 100 (e.g., via the common system air conduit 345, which may include a bottom portion of the racks 300 below the test slots 330) to move air through each of the air conduits. The system air mover 190 moves air exterior of the racks 300 through the test slots 330 into the air conduits 304 and back out of the racks 300.
In the example shown in FIG. 6B, the air conduit 304 (also shown in FIGS. 10A and 10B) provides pneumatic communication between each test slot 330 of the respective rack 300 and an air heat exchanger 350. The air heat exchanger 350 is disposed below the carrier receptacles 310 remote to received test slots 330. The air heat exchanger 350 includes an air heat exchanger housing 352 defining an entrance 351, an exit 353, and an air flow path 305 therebetween. In some implementations, cooling elements 354 are disposed in the housing 352 in the air flow path 305 and a pump 356 delivers condensation accumulated from the air heat exchanger 350 to an evaporator 360, which may be disposed on the respective rack 300 of the air heat exchanger 350 (e.g., above the carrier receptacles 310), or to a drain. The air heat exchanger 350 may include an air mover 358 that pulls the air from the air conduit 304 into the entrance 351 of the air heat exchanger housing 352 over the cooling elements 354, if implemented, and moves the air out of the air heat exchanger housing exit 353 and out of the rack 300.
Referring to FIGS. 7A-7C, each test slot carrier 320 includes a body 322 having test slot receptacles 324 that are each configured to receive a test slot 330. Each test slot 330 is configured to receive a storage device transporter 800, which is configured to receive the storage device 500 and be handled by the manipulator 210 of the robotic arm 200. In use, one of the storage device transporters 800 is removed from or delivered to one of the test slots 330 by the robotic arm 200. Each test slot receptacle 324 may include one or more isolators 326 (e.g., rubber grommet) to dampen or isolate vibrations between the carrier body 322 and a received storage device 500. A detailed description of the test slot carrier 320 and other details and features combinable with those described herein may be found in the following U.S. patent applications filed Feb. 2, 2010, entitled “Test Slot Carriers”, inventors: Brian Merrow et al., and having assigned Ser. No. 12/698,605, the entire contents of which are hereby incorporated by reference.
Referring to FIGS. 7C and 8A-8C, each test slot 330 includes a test slot housing 340 for receipt by the rack 300 or a test slot receptacle 324 of a test slot carrier 320. The test slot housing 340 has first and second portions 342, 344. The first portion 342 of the test slot housing 340 defines a device opening 346 sized to receive a storage device 500 and/or a storage device transporter 800 carrying the storage device 500. The second portion 344 of the test slot housing 340 includes an air exit 348, electronics 390 (e.g., circuit board(s)), and an optional air mover 900. The electronics 390 are in communication with a test slot connector 392, which is configured to receive and establish electrical communication with a storage device connector 532 of the storage device 500. The electronics 390 also include a slot-rack connector 394 for establishing electrical communication with the rack 300. Air moved through the test slot 300 can be directed over the electronics 390.
FIG. 9 illustrates an exemplary air mover 900 which has an air entrance 902 that receives air along a first direction 904 and an air exit 906 that delivers air along a second direction 908 substantially perpendicular to the first direction. Changing the direction of air movement within the air mover 900 eliminates the efficiency loss of changing the air flow direction within a conduit, thereby increasing the cooling efficiency of the storage device testing system 100. In some implementations, the air mover 900 includes an impeller 910 rotating at about 7100 revolutions per minute (rpm) to produce an air flow rate of up to about 0.122 m3/min (4.308 CFM) (at zero static pressure) and an air pressure of up to about 20.88 mmH2O (0.822 inch H2O) (at zero air flow). In some instances, the air mover 900 is the largest component of a cooling system for a test slot 330. The substantially horizontal placement of the air mover 900 within the storage device testing system 100 allows for a relatively lower overall height of the test slot 330 (allowing greater test slot density in the rack 300 and/or test slot carrier 320).
FIGS. 7C and 10A-10B illustrate a flow path 305 of air through test slots 330 and a rack 300 for regulating the temperature of a storage device 500 received in the storage device testing system 100. The air mover 900 of each test slot 330 housed in the rack 300 moves a flow of air from an exterior space of the rack 300 into at least one entrance 832 of the air director 830 of a storage device transporter 800 received in the test slot 330. The air flow is directed substantially simultaneously over at least top and bottom surfaces 512, 514 of the storage device 500 received in the storage device transporter 800. FIG. 7C provides a side sectional view of the test slot 330 and the air flow path 305 over the top and bottom surfaces 512, 514 of the received storage device 500. The air may also flow over other surfaces of the storage device 500 (e.g., front, back, left and right sides 516, 518, 520, 522). If no storage device 500 or storage device transporter 800 is received in the test slot 330, the air can flow directly through the first portion 342 of the test housing 340 to the air mover 900. The air mover 900 moves the air through the second portion 344 of the test slot housing 340 and out an air exit 348 (FIG. 7B) of the test slot 330 into the air conduit 304. The air moves through the air conduit 304 to the air heat exchanger 350 or the environment exterior to the rack 300. After passing through the air heat exchanger 350 the air is released back into the exterior space of the rack 300.
In some examples, the air mover 900 pulls the air into the air director 830 of storage device transporter 800, which directs the air flow 305 over at least the top and bottom surfaces 512, 514 of the storage device 500. The air mover 900 receives the flow of air from over the received storage device 500 along a first direction and delivers the air flow from the air mover 900 to the exit 348 of the test slot 330 along a second direction substantially perpendicular to the first direction.
In the examples shown, the storage device transporter 800 provides closure of the device opening 346 of the test slot housing 340 once received therein. As the air mover 900 moves the air to circulate along the air path 305, the air moves from the first portion 342 of the test slot housing 340 along a common direction to the second portion 344 of the test slot housing 340 while traversing the entire length of the received storage device 500. Since the air moves substantially concurrently along at least the top and bottom surfaces 512, 514 of the storage device 500, the air provides substantially even cooling of the storage device 500. If the air was routed along one side of the storage device first, such as the top surface 512, and then directed along another side sequentially second, such as the bottom surface 514, the air would become preheated after passing over the first side of the storage device 500 before passing over any additional sides of the storage device, thereby providing relatively less efficient cooling than flowing air over two or more sides of the storage device 500 substantially concurrently and/or without recirculation over the storage device 500 before passing through the air heat exchanger 350.
A method of performing storage device testing includes presenting one or more storage devices 500 to a storage device testing system 100 for testing at a source location (e.g., a loading/unloading station 600, storage device tote 700, test slot(s) 330, etc.) and actuating an automated transporter 200 (e.g. robotic arm) to retrieve one or more storage devices 500 from the source location and deliver the retrieved storage device(s) 500 to corresponding test slots 330 disposed on a rack 300 of the storage device testing system 100. The method includes actuating the automated transporter 200 to insert each retrieved storage device 500 in its respective test slot 330, and performing a test (e.g., functionality, power, connectivity, etc.) on the storage devices 500 received by the test slot 330. The method may also include actuating the automated transporter 200 to retrieve the tested storage device(s) 500 from the test slot(s) 330 and deliver the tested storage device(s) 500 to a destination location (e.g., another test slot 330, a storage device tote 700, a loading/unloading station 600, etc).
A method of regulating the temperature of a storage device 500 received in a storage device testing system 100 includes moving a flow of air into an air entrance 346 of a test slot housing 340 of a test slot 330 of a rack 300, moving the air flow over a storage device 500 received in the test slot 330, moving the air out an air exit 348 of the test slot housing 340 of the test slot 330, and releasing the air exteriorly of the rack 300. This method may be executed on a storage device testing system 100 to reduce the relative number of temperature control components generally required, while still allowing separate control of the temperature of each test slot 330. The method allows the storage device testing system 100 to have separate thermal control for each storage device test slot 330, with relatively fewer thermal control components, and without a separate closed loop air flow path for each test slot 330. In some examples, the method results in substantially no condensation forming in or near the test slot(s) 330, without having to manage the moisture content of the air.
In some implementations, the method includes using a common reservoir of cooled air, which may cooled by one or more air heat exchangers 350. Condensation formed on the air heat exchanger(s) 350 is concentrated in relatively few locations and may be removed by conventional methods, such as evaporators or drains. Alternatively, the heat exchanger(s) 350 may be controlled to operate above the dew point. Air from the common reservoir is drawn though each test slot 330 using a separate controllable air mover 900 for each test slot 330. The amount of cooling may be controlled by the speed of the air mover 900. To heat a storage device 500 received in a test slot 330, a heater 860 may be disposed so as to heat the received storage device 500 either directly or indirectly. For example, the heater 860 maybe placed in the inlet air path 346 to the test slot 330 and/or in direct contact with the received storage device. In some examples, the method includes allowing the received storage device 500 to self heat by reducing or shutting off the air flow through the test slot 300. In some implementations, the reservoir of cooled air is formed by the shape of the storage device testing system 100, rather than by a separate enclosure. The cooling air may also be used to cool other electronics disposed with in the storage device testing system 100.
In some examples, the air is moved to flow substantially simultaneously over at least the top and bottom surfaces 512, 514 of the storage device 500 received in the test slot 330. In some implementations, the method includes pulling air exterior of the rack 300 into a first portion 342 of the test slot housing 340 with an air mover 900 disposed in the test slot housing 340 and then moving the air through a second portion 344 of the test slot housing 340 over electronics 350 disposed in the second portion 344 and out an air exit 348 of the test slot housing 340. The method may include receiving the flow of air into the air mover 900 along a first direction 904 and moving the flow to the air exit 906 of the air mover 900 along a second direction 908 substantially perpendicular to the first direction 904. In some examples, the method includes delivering the air flow out of the air mover 900 at an air flow rate of up to about 0.122 m3/min (4.308 CFM) and an air pressure of up to about 20.88 mmH2O (0.822 inchH2O).
The method may include moving the air flow through an air director 830 of a storage device transporter 800 holding the storage device 500 and received in the test slot 330. The air director 830 defines one or more air entrances 832 that receive and direct the flow of air over at least the top and bottom surfaces 512, 514 of the storage device 500. The storage device transporter 800 includes a body 800 having first and second portions 802, 804. In some examples, the method includes receiving the storage device 500, which has top, bottom, front, rear, right, and left side surfaces 512, 514, 516, 518, 520, 522, in the storage device transporter 800 such that the rear surface 518 substantially faces the first body portion 802 of the storage device transporter body 800.
In some implementations, the method includes moving the flow of air from the test slot 330 to an air heat exchanger 350 through an air conduit 304 that provides pneumatic communication therebetween. The air heat exchanger 350, in some examples, includes an air mover 358 that pulls the air from the air conduit 304 into the entrance 351 of the air heat exchanger housing 352 over the cooling elements 354 and moves the air out of the air heat exchanger housing exit 353 and out of the rack 300. The method may also include pumping condensation of the air heat exchanger 350 to an evaporator 360 disposed on the rack 300 or pumping to a drain, or allowing the condensate to drain through gravity.
OTHER IMPLEMENTATIONS
A number of implementations have been described. Nevertheless, it will be understood that various modifications may be made without departing from the spirit and scope of the disclosure. For example, the air may flow in the opposite direction from that given in the exemplary embodiments. Air may also flow over only one side of the storage device, instead of over both the top and bottom surfaces. In systems with one air mover per test slot, the test slot air mover may be disposed in a number of locations, some not physically connected to the slot. Thermal control of the test slot may include means of heating the air by the addition of a heater in the inlet stream of the test slot. While implementations described above included a storage device transporter in the form of a removable carrier that is entirely removable from a test slot, in some implementations the storage device transporter is not entirely removable from the test slot, but instead remains connected to the test slot in the form of a drawer. For example, FIGS. 11A and 11B illustrate an implementation of a test slot assembly in which the storage device transporter 800′ includes projections 805 which slide within recessed slots 335 in the walls of the test slot 330′. Forward movement and complete removal of the storage device transporter 800′ is impeded (e.g., prevented) by the end position of the recessed slots 335. Thus, in this example, the storage device transporter 800′ operates as a drawer that is slidable relative to the test slot 330′ allowing insertion and removal of storage devices to and from the test slot 330′.
FIGS. 12A-22 illustrate another implementation of a test slot that may be employed in storage device testing systems, such as described above. In the example illustrated in FIGS. 12A-13, each test slot 1330 is configured to receive the storage device transporter 1800. The storage device transporter 1800 is configured to receive the storage device 500 and be handled by the manipulator 210 (FIG. 4) of the robotic arm 200 (FIG. 1). In use, one of the storage device transporters 1800 is removed from or delivered to one of the test slots 1330 by the robotic arm 200. Each test slot 1330 includes a test slot housing 1340 received by the rack 300 and having first and second portions 1342, 1344. The first portion 1342 of the test slot housing 1340 defines a device opening 1346 sized to receive a storage device 500 and/or a storage device transporter 1800 carrying the storage device 500 as well as a first air opening 1326 (i.e., air entrance). The second portion 1344 of the test slot housing 1340 defines a second air opening 1348 (i.e., air exit) and houses electronics 1390.
As illustrated in FIGS. 14-17, the storage device transporter 1800 includes a transporter body 1810 having first and second portions 1802, 1804. The first portion 1802 of the transporter body 1810 includes a manipulation feature 1812 (e.g., indention, protrusion, etc.) configured to receive or otherwise be engaged by the manipulator 210 for transporting. The second portion 1804 of the transporter body 1810 is configured to receive a storage device 500. In some examples, the second transporter body portion 1804 defines a substantially U-shaped opening 1820 formed by first and second sidewalls 1822, 1824 and a base plate 1826 of the transporter body 1810. The storage device 1500 is received in the U-shaped opening 1820 and supported by at least the base plate 1826. FIG. 17 illustrates an exemplary storage device 500 that includes a housing 510 having top, bottom, front, rear, left and right surfaces 512, 514, 516, 518, 520, 522. The storage device 500 is typically received with its rear surface 518 substantially facing the first portion 802 of the storage device transporter body 1800. The first portion 1802 of the transporter body 1810 includes an air director 1830 that receives and directs air substantially simultaneously (e.g., in parallel) over at least the top and bottom surfaces 512, 514 of the storage device 500 received in the storage device transporter 1800. The air director 1830 defines an air cavity 1831 having an air entrance 1832 and first and second air exits 1834, 1835. The air director 1830 directs air received through its air entrance 1832 out of the first and second air exits 1834, 1835. The first air exit 1834 directs air over the top surface 512 of the received storage device 1800 and the second air exit 1835 directs air over the bottom surface 514 of the received storage device 500.
In some implementations, the air director 1830 includes a plenum 1836 disposed in the cavity 1831 for directing at least a portion of the air received through the air entrance 1832 out through the first air exit 1834 and over at least the bottom surface 514 of the received storage device 500. In some implementations, the air director 1830 is weighted to stabilize the storage device transporter 1800 against vibration. For example, the plenum 1836 can be weighted or fabricated of a material having a suitable weight. Air entering into the air cavity 1831 can also flow over a partition 1838 (above which is the second air exit 1835) to flow over at least the top surface 512 of the storage device 500. With the storage device 500 received within the transporter body 1810, the storage device transporter 1810 and the storage device 500 together can be moved by the automated transporter 200 (FIG. 1) for placement within one of the test slots 310.
Some storage devices 500 can be sensitive to vibrations. Fitting multiple storage devices 500 in a single test rack 300 and running the storage devices 500 (e.g., during testing), as well as the insertion and removal of the storage device transporters 550, each optionally carrying a storage device 500, from the various test slots 1330 in the test rack 300 can be sources of undesirable vibration. In some cases, for example, one of the storage devices 500 may be operating under test within one of the test slots 1330, while others are being removed and inserted into adjacent test slots 1330 in the same rack 300. Clamping the storage device transporter 1800 to the test slot 1330 after the storage device transporter 550 is fully inserted into the test slot 1330 can help to reduce or limit vibrations by limiting the contact and scraping between the storage device transporters 1800 and the test slots 1330 during insertion and removal of the storage device transporters 1800.
In some implementations, the manipulator 210 (see, e.g., FIGS. 2 & 4) is configured to initiate actuation of a clamping mechanism 1840 disposed in the storage device transporter 1800. This allows actuation of the clamping mechanism 1840 before the storage device transporter 1800 is moved to and from the test slot 1330 to inhibit movement of the storage device 500 relative to the storage device transporter 1800 during the move. Prior to insertion in the test slot 1330, the manipulator 210 can again actuate the clamping mechanism 1840 to release the storage device 500 within the transporter body 1810. This allows for insertion of the storage device transporter 1800 into one of the test slots 1330, until the storage device 500 is in a test position engaged with the test slot 1330 (e.g., a storage device connector 532 of the storage device 500 (FIG. 17) is engaged with a test slot connector 1392 (FIG. 18) of the test slot 1330). The clamping mechanism 1840 may also be configured to engage the test slot 1330, once received therein, to inhibit movement of the storage device transporter 1800 relative to the test slot 1330. In such implementations, once the storage device 500 is in the test position, the clamping mechanism 1840 is engaged again (e.g., by the manipulator 210) to inhibit movement of the storage device transporter 1800 relative to the test slot 1330. The clamping of the storage device transporter 1800 in this manner can help to reduce vibrations during testing. In some examples, after insertion, the storage device transporter 1800 and storage device 500 carried therein are both clamped or secured in combination or individually within the test slot 1330.
Referring again to FIGS. 12A-13 as well as FIG. 18, the rack 300 includes a test slot cooling system 1900 disposed adjacent to each test slot 1330. The test slot cooling system 1900 includes a housing 1910 having first and second air openings 1912, 1914 (i.e., air exit and air entrance). The housing 1910 receives air from the test slot 1330 through the second air opening 1914 and directs the air through an air cooler 1920 to an air mover 1930 (e.g., blower, fan, etc.). In the example shown in FIG. 19, the air cooler 1920 includes an air cooler body 1922 having one or more fins or plates 1924 disposed thereon. The air cooler 1920 is coupled or attached to a cooling tube 1926 through which a chilled liquid (e.g., water) flows. The chilled cooling tube 1926 conducts heat from the air cooler 1920 which receives heat through convection from air flowing over the fins 1924. The air mover 1930 moves the air through the first air opening 1912 back into the test slot 1330 through its first air opening 1326. The first air opening 1326 of the test slot housing 1340 is substantially aligned with the first air opening 1912 of the test slot cooling system housing 1900, and the second air opening 1348 of the test slot housing 1340 is substantially aligned with the second air opening 1914 of the test slot cooling system housing 1900. In examples using the storage device transporter 1800, the first air opening 1326 of the test slot housing 1340 is substantially aligned with the air entrance 1832 of the transporter body 1810 for delivering temperature controlled air over a storage device 500 carried by the storage device transporter 1800.
FIG. 20 illustrates an exemplary air mover 1930 which has an air entrance 1932 that receives air along a first direction 1934 and an air exit 1936 that delivers air along a second direction 1938 substantially perpendicular to the first direction. Changing the direction of air movement within the air mover 1930 eliminates the efficiency loss of changing the air flow direction within a conduit, thereby increasing the cooling efficiency of the test slot cooling system 1900. In some implementations, the air mover 1930 includes an impeller 1935 rotating at about 7100 revolutions per minute (rpm) to produce an air flow rate of up to about 0.122 m3/min (4.308 CFM) (at zero static pressure) and an air pressure of up to about 20.88 mmH2O (0.822 inchH2O) (at zero air flow). In some instances, the air mover 1930 is largest component of the test slot cooling system 1900 and therefore dictates the size of the test slot cooling system 1900. In some implementations, the air mover 1930 has length L of about 45 mm, a width W of about 45 mm, and a height H of about 10 mm, such as DC Blower BFB04512HHA-8A60 provided by Delta Electronics, Inc., Taoyuan Plant, 252 Shang Ying Road, Kuei San Industrial Zone, Yaoyuan Shien, Taiwan R.O.C. The substantially horizontal placement of the air mover 1930 within the test slot cooling system 1900 allows for a relatively lower overall height of the test slot cooling system 1900, and therefore a relatively lower overall height of an associated test slot 1330 (allowing greater test slot density in the rack 300). The ability of the air mover 1930 to redirect the air flow path 1950 (FIG. 21) reduces air resistance in the air flow path 1950, thereby lowering the power consumption of the air mover 1930 to maintain a threshold air flow rate.
FIG. 21 provides a top view of the rack 300 and illustrates the air flow path 1950 through the test slot cooling system 1900 and the test slot 1330. FIG. 22 provides a side sectional view of the test slot 1330 and the air flow path 1950 over the top and bottom surfaces 512, 514 of the received storage device 500. The air may also flow over other surfaces of the storage device 500 (e.g., front, back, left and right sides 516, 518, 520, 522). The air mover 1930 delivers air through the first air opening 1912 (i.e., air entrance) of the test slot cooling system housing 1900 and the first air opening 1326 (i.e., air entrance) of the test slot housing 1340 into the air director 1830 of the storage device transporter body 1810. The air flows through the air entrance 1832 of the air director 1830 in to the air cavity 1831. The air flows out of the first air exit 1834 of the air director 1830 (e.g., as directed by the plenum 1836) and over at least the bottom surface 514 of the storage device 500. The air also flows through the second air exit 1835 (e.g., over the partition 1838) and over at least the top surface 512 of the storage device 500. The air moves from the first portion 1342 of the test slot housing 1340 to the second portion 1344 of the test slot housing 1340. The air may move over the electronics 1390 in the second portion 1344 of the test slot housing 1340. The air exits the test slot housing 1340 through its second air opening 1348 (i.e., air exit) into the second air opening 1914 (i.e., air entrance) of the test slot cooling system housing 1900. The air travels over the air cooler 1920 (e.g., over the air cooler fins 1924) which is disposed in or adjacent to the air flow path 1950 and then back into the air entrance 1932 of the air mover 1930.
In the examples shown, the storage device transporter 1800 provides closure of the device opening 1346 of the test slot housing 1340 once received therein. The air director 1830 of the storage device transporter 1800 and the air mover 1930 are situated near the inlet of the device opening 1346 of the test slot housing 1340. As the air mover 1930 moves the air to circulate along the air path 1950, the air moves from the first portion 1342 of the test slot housing 1340 along a common direction to the second portion 1344 of the test slot housing 1340 while traversing the entire length of the received storage device 500. Since the air moves substantially concurrently along at least the top and bottom surfaces 512, 514 of the storage device 500, the air provides substantially even cooling of the storage device 500. If the air was routed along once side of the storage device first, such as the top surface 512, and then directed along another side sequentially second, such as the bottom surface 514, the air would become preheated after passing over the first side of the storage device 500 before passing over any additional sides of the storage device, thereby providing relatively less efficient cooling than flowing air over two or more sides of the storage device 500 substantially concurrently and/or without recirculation over the storage device 500 before passing through the air cooler 1920.
A method of performing storage device testing includes presenting one or more storage devices 500 to a storage device testing system 100 for testing at a source location (e.g., a loading/unloading station 600, storage device tote 700, test slot(s) 310, etc.) and actuating an automated transporter 200 (e.g. robotic arm) to retrieve one or more storage devices 500 from the source location and deliver the retrieved storage device(s) 500 to corresponding test slots 1330 disposed on a rack 300 of the storage device testing system 100. The method includes actuating the automated transporter 200 to insert each retrieved storage device 500 in its respective test slot 1330, and performing a test (e.g., functionality, power, connectivity, etc.) on the storage devices 500 received by the test slot 1330. The method may also include actuating the automated transporter 200 to retrieve the tested storage device(s) 500 from the test slot(s) 310 and deliver the tested storage device(s) 500 to a destination location (e.g., another test slot 310, a storage device tote 700, a loading/unloading station 600, etc).
A method of regulating the temperature of a storage device 500 received in a storage device testing system 100 includes delivering a flow of air into an air entrance 1346 of a test slot housing 1340 and directing the air flow substantially simultaneously over at least the top and bottom surfaces 512, 514 of the storage device 500. The method may include delivering the air flow to an air director 1830 that directs the air flow over at least the top and bottom surfaces 512, 514 of the storage device 500. In some implementations, the method includes supporting the storage device 500 in a storage device transporter 1800 received in the test slot housing 1340. The storage device transporter 1800 includes a body 1810 having first and second portions 1802, 1804. The first storage device transporter body portion 1802 includes the air director 1830 and the second storage device transporter body portion 1804 is configured to receive the storage device 500. The storage device 500 has top, bottom, front, rear, right, and left side surfaces 512, 514, 516, 518, 520, 522 and is received with its rear surface 518 substantially facing the first body portion 1802 of the storage device transporter body 1810. The method may include weighting the air director 1830, in some examples the plenum 1836) to reduce movement of the storage device transporter while received by the storage device testing system.
In some implementations, the method includes delivering the air flow into an air entrance 1832 of the air director 1830. The air director 1830 directs the air received through the air entrance 1832 out first and second air exits 1834, 1835 of the air director 1830. The first air exit 1834 directs air over at least the bottom surface 514 of the received storage device 500 and the second air exit 1835 directs air over at least the top surface 512 of the received storage device 500. The air director 1830 may define a cavity 1831 in pneumatic communication with the air entrance 1832 and air exits 1834, 1835 of the air director 1830. The air director 1830 includes a plenum 1836 disposed in the cavity 1831 for directing at least a portion of the air received in the cavity 1831 out of the first air exit 1834. In some examples, the method includes weighting the plenum 1836 to reduce movement of the storage device transporter 1800 while received by the storage device testing system 100 (e.g., while received in the test slot 1330).
In some implementations, the method includes directing the flow of air to an air mover 1930 in pneumatic communication with the air entrance 1325 of the test slot housing 1340. The air mover 1930 delivers the flow of air into the air entrance 1326 of a test slot housing 320 with the air flow moving along a closed loop path 950 (FIG. 15). The method may 1340 receiving the flow of air into the air mover 1930 along a first direction 1934 and delivering the air flow to the air entrance 1326 of the test slot housing 1340 along a second direction 1938 substantially perpendicular to the first direction 1934. The method includes directing the flow of air over an air cooler 1920 disposed in the air flow path 1950 upstream of the air mover 1930. In some examples, the method includes delivering the air flow into the air entrance 1326 of the test slot housing 1340 (e.g., via the air mover 1930) at an air flow rate of up to about 0.122 m3/min (4.308 CFM) and an air pressure of up to about 20.88 mmH2O (0.822 inchH2O).
Accordingly, other implementations are within the scope of the following claims.

## Claims

1. A storage device transporter comprising:
A) a transporter body comprising:
i) a first body portion configured to be engaged by automated machinery for manipulation of the storage device transporter; and
ii) a second body portion configured to receive and support a storage device,

wherein the first body portion is configured to receive and direct an air flow over one or more surfaces of a storage device supported in the second body portion.

2. The storage device transporter of claim 1, wherein the first body portion includes an air director having one or more air entrances for receiving air into the first body portion and directing air into the second body portion.

3. The storage device transporter of claim 2, wherein the one or more air entrances are configured to be engaged by automated machinery for manipulation of the storage device transporter.

4. The storage device transporter of claim 1, wherein the second body portion comprises first and second sidewalls arranged to receive a storage device therebetween.

5. The storage device transporter of claim 1, wherein the first body portion comprises one or more vision fiducials.

6. The storage device transporter of claim 1, further comprising a clamping mechanism operable to clamp a storage device within the second body portion.

7. The storage device transporter of claim 1, wherein the first body portion is configured to direct air over top and bottom surfaces of a storage device supported in the second body portion.

8. The storage device transporter of claim 1, wherein the first body portion includes an air director having one or more air entrances for receiving air into the first body portion and directing air into the second body portion, and wherein the one or more air entrances are arranged to register the storage device transporter in X, Y, and rotational directions when the storage device transporter is engaged by automated machinery.

9. The storage device transporter of claim 1, wherein the second body portion defines a substantially U-shaped opening which allows air to flow over a bottom surface of a storage device supported in the storage device transporter.

10. A test slot assembly comprising:
A) a storage device transporter comprising
i) a transporter body comprising:
a) a first body portion configured to be engaged by automated machinery for manipulation of the storage device transporter; and
b) a second body portion configured to receive and support a storage device, wherein the first body portion is configured to receive and direct an air flow over one or more surfaces of a storage device supported in the second body portion.


B) a test slot comprising:
i) a housing defining:
a) a test compartment for receiving and supporting the storage device transporter, and
b) an open end providing access to the test compartment for insertion and removal of the disk drive transporter.

11. The test slot assembly of claim 10, wherein the storage device transporter is completely removable from the test compartment.

12. The test slot assembly of claim 10, wherein the storage device transporter is connected to the test slot in such a manner as to form a drawer for receiving a storage device.

13. A storage device testing system comprising:
A) automated machinery; and
B) A storage device transporter comprising:
i) a transporter body comprising:
a) a first body portion configured to be engaged by the automated machinery for manipulation of the storage device transporter; and
b) a second body portion configured to receive and support a storage device, wherein the first body portion is configured to receive and direct an air flow over one or more surfaces of a storage device supported in the second body portion.

14. The storage device testing system of claim 13, wherein the first body portion includes an air director having one or more air entrances for receiving air into the first body portion and directing air into the second body portion, and wherein the one or more air entrances are configured to be engaged by the automated machinery for manipulation of the storage device transporter.

15. The storage device testing system of claim 14, wherein the automated machinery includes a mechanical actuator adapted to engage the one or more air entrances.

16. The storage device testing system of claim 13, wherein the first body portion comprises one or more vision fiducials, and wherein the automated machinery includes an optical system for detecting the vision fiducials.

17. The storage device testing system of claim 13, wherein the automated machinery includes posts, and wherein the first body portion includes one or more air entrances for receiving air into the first body portion and directing air into the second body portion, the air entrances being arranged to be engaged by the posts to register the storage device transporter in X, Y, and rotational directions when the storage device transporter is engaged by the automated machinery.

18. The storage device testing system of claim 13, wherein the first body portion includes a pair of slots, and wherein the automated machinery includes a pair of claws operable to engage the slots.

19. The storage device testing system of claim 13, further comprising a clamping mechanism operable to clamp a storage device within the second body portion, wherein the automated machinery is operable to actuate the clamping mechanism.

20. The storage device testing system of claim 13, wherein the automated machinery comprises a robotic arm and a manipulator attached to the robotic arm, the manipulator being configured to engage the storage device transporter.