In the first issue of the AMMTIAC Quarterly we

introduced AMMTIAC as the newest of the nine

Defense Technical Information Center (DTIC)

sponsored Information Analysis Centers (IACs). In

that issue we discussed how the basic 

functions of three predecessor IACs,

namely AMPTIAC, MTIAC and NTIAC,

were merged into a single new entity,

AMMTIAC. We also mentioned that the

new center was in many ways more than

the sum of its parts. One of the significant

changes of the new center, as compared 

to its predecessors, is a general extension and broadening of our scope in the area of testing. No longer

are we restricted to the field of traditional nondestructive testing (NDT). The expanded scope

includes all aspects related to the physical, mechanical, and functional testing of materials, components, and items. Within this, nondestructive

testing is only one element, albeit, a critical one.

The AMMTIAC Team retained the assets and

expertise from the Nondestructive Testing IAC

(NTIAC), and because NDT has evolved over the

years into a sophisticated and often very effective

solution to many challenges, we wanted to leverage this established knowledge and talent for the

ultimate benefit of the warfighter. However, it is

also important that we emphasize that our legacy

of knowledge and expertise is not limited to nondestructive methods. From the Advanced Materials and Processes Technology IAC (AMMTIAC)

we retained a vast amount of information and

expert knowledge on conventional materials testing techniques as well; including fatigue testing,

corrosion testing, accelerated testing, and many

other testing methods. From the Manufacturing

Technology IAC (MTIAC) we retained the knowledge and expertise of in-process manufacturing

testing and evaluation. Combining these three

focused areas of testing, while expanding the scope

to incorporate testing of materials, components,

and items in general, has enabled DTIC to provide a comprehensive resource for the acquisition,

operations, and sustainment communities.

For the first several issues of the AMMTIAC

Quarterly, we are focusing a lot of attention on the

area of NDT, because as mentioned earlier, it is a

critical technology area that enables the safe operation of many Defense assets. In this issue of the 

AMMTIAC Quarterly, for instance, we have two

articles relevant to nondestructive testing. The

first is a new technology used to inspect complex

wiring systems for defects and damage. Secondly,

in the inaugural edition of TechSolutions, which 

is our tutorial-styled feature dedicated to solving

problems through technologies and technical

methods, we give an overview and introduction to

the area of NDT. In issues to follow we will delve

deeper into the specific NDT methods to teach

non-experts how the various methods work, 

how they are applied, and where they can be

used. Ultimately, when we finish covering all of

the eight common NDT methods, we will combine the articles into a desk reference, similar to

the one we did on material failure modes (see

http://ammtiac.alionscience.com/pdf/deskref.pdf).

Ben Craig

Editor

AMMTIAC’s

Expanded Role 

in the Area 

of Testing

The AMMTIAC Quarterly is published by the Advanced Materials, Manufacturing, and Testing Information 

Analysis Center (AMMTIAC). AMMTIAC is a DoD-sponsored Information Analysis Center, administratively

managed by the Defense Technical Information Center (DTIC). Policy oversight is provided by the Office of the

Secretary of Defense, Director of Defense Research and Engineering (DDR&E). The AMMTIAC Quarterly is

distributed to more than 15,000 materials, manufacturing, and testing professionals around the world.

Inquiries about AMMTIAC capabilities, products, and services may be addressed to 

David H. Rose

Director, AMMTIAC

315-339-7023

EMAIL : ammtiac@alionscience.com

URL : http ://ammtiac.alionscience.com

We welcome your input! To submit your related articles, photos, notices, or ideas for future issues, please contact:

AMMTIAC

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201 Mill Street

Rome, New York 13440

PHONE: 315.339.7019

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EMAIL : ammtiac_news@alionscience.com

Editor-in-Chief

Benjamin D. Craig

Publication Design 

Cynthia Long

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Judy E. Tallarino

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Product Sales

Gina Nash
http://ammtiac.alionscience.com The AMMTIAC Quarterly, Volume 1, Number 2 3

INTRODUCTION

Detecting and locating insulation defects in wiring systems is a nontrivial challenge. Ideally, the diagnostic should be nondestructive,

capable of detecting a variety of insulation defects, such as cracking,

chaffing, and abrasion, and be able to locate the defect accurately to

reduce potential inspection and maintenance costs. The diagnostic

should also have a low rate of false detection. Complicating this

quest is the nature of complex wiring systems. For example, aircraft

wiring systems are comprised of harnesses containing periodically

bound single wire pairs* which create highly non-uniform impedance characteristics due to the varying distance between wire pairs.

Insulation defects may also be physically small, resulting in an

immeasurable change in the impedance at the defect site. These

characteristics tend to render impedance measuring or conventional time-domain-reflectometry (TDR)† concepts ineffective. Other

approaches such as partial discharge or DC breakdown techniques

may detect some types of insulation defects, but cannot locate them

in complex impedance wiring systems (Figure 1).

PULSE ARRESTED SPARK DISCHARGE

Pulse Arrested Spark Discharge (PASD) has been demonstrated to

be an effective insulation diagnostic for coaxial cables, twisted

shielded pair, and more complex single wire bundles commonly 

found in wiring systems in aircraft and control and monitoring

devices. PASD employs a patented, low-energy, arrested-arc concept

and time domain reflectometry techniques to produce a welldefined reflection from an insulation defect site. The PASD diagnostic can detect and locate a range of electrical insulation damage

in cable/wire bundles with non-uniform impedance profiles.

PASD was first demonstrated on electrical wiring systems in 1996

under a Department of Energy (DOE) sponsored nuclear energy

program. Success during the initial development of PASD for the

DOE led to a contract with the U.S. Navy to explore the use of 

this concept for wiring in control and power systems. This work,

completed in August 2001, demonstrated the ability of this technique to identify and locate gross defects, as well as difficult to find

small-volume dielectric defects in a laboratory environment [1].

This foundational work with PASD led to a three-year Federal 

Aviation Administration (FAA) sponsored program, beginning in

October 2002, that focused on commercial aircraft wiring systems.

This FAA program culminated in the practical utilization of the

PASD technique. PASD has demonstrated great potential to locate

aircraft wiring flaws‡, which are due to aging processes, manufacturing defects, maintenance, and installation damage, as well as a variety of other defects in more conventional wire/cable systems [2].

Larry X Schneider

Pulsed Power Sciences Center

Sandia National Laboratories

Albuquerque, NM

The article entitled “Wired for Success: Ensuring Aircraft Wiring Integrity Requires a Proactive Systems Approach”, which was published in Vol. 8,

No. 3 of the AMPTIAC Quarterly (a predecessor to the AMMTIAC Quarterly), established the importance of maintaining wiring integrity, 

especially in aging aircraft. The article also emphasized the need for nondestructive approaches for evaluating the integrity of wiring systems and

components. The current article answers the mail in terms of providing a nondestructive inspection (NDI) method to proactively ensure wiring

integrity. – Editor

Figure 1. Inspection of Aircraft Wiring Systems.
4 The AMMTIAC Quarterly, Volume 1, Number 2

HOW PASD WORKS

The PASD technique uses a high-voltage (approximately 10 kilovolts), low-energy (a few millijoules), short pulse to induce an 

electrical spark discharge (breakdown) at the site of an insulation

defect (Figure 2). The PASD pulse can be generated by a compact,

battery driven pulser (Figure 3) and combined with diagnostics that

includes software processing in a package the size of a small suitcase.

The pulse energy is similar in magnitude to the static discharge generated when walking across synthetic carpets and is insufficient to

damage typical insulation or the conductors within wiring systems.

The discharge occurs from the conductor in the wire under test to

an adjacent return path which typically is another wire or ground

plane (e.g., aircraft skin). The development of an arc occurs within

a few nanoseconds and produces a momentary short circuit that

reflects energy back to the sensors at the injection point. 

Conventional TDR techniques can then be used to accurately locate

the defect site. This technique is a direct test of the dielectric

strength of the insulation system. Since the PASD voltage is insufficient to breakdown any significant amount of bulk insulation, only

defects which expose the center conductor are identified.

The technique begins with characterizing the impedance of the

wire under evaluation, much like a conventional TDR technique,

using the PASD pulse at a low voltage setting (hundreds of volts).

This establishes an impedance baseline which is critical to PASD’s

ability to evaluate non-uniform impedance wiring systems. The

injected pulse voltage is then raised in gradual steps to explore for

defects. If a sufficient defect is present, the sensor waveform will

deviate from the low voltage baseline characterization.

Figure 4 shows example waveforms derived from PASD tests on a

coaxial cable with a 0.7 mm hole punched through the dielectric.

The inner conductor and outer shield remain fully conductive. The

two waveforms deviate at the location of the defect, 78 nanoseconds

(ns) down the line. In this example, the peak PASD pulse was 

9.8 kV at a pulse width of 5 ns. The amplitude scale is the voltage

measured at the sensor. The location of the anomaly between the

two waveforms describes the physical location of the defect site.

Figure 5 shows PASD waveforms from a test of a damaged 

twisted shielded-pair cable. Although the insulation and electrical

shielding is damaged, the inner conductors and shields remain 

electrically conductive. The impedance of this cable is highly nonuniform, as evidenced by the multiple reflections in the PASD 

baseline (solid line). The dashed line is the normalized PASD pulse

(4.5 kV) which creates a breakdown at the defect site. The two

waveforms separate at approximately 45 ns, accurately indicating

the location of the defect. A simple differencing algorithm can easily locate the point where the two waveforms deviate, as illustrated

in Figure 4 and Figure 5.

PASD can be applied using several different techniques, including

multiple pulse injection which improves PASD’s response in long

lines. PASD has been effectively demonstrated in wire harnesses up

to 200 feet in length

NONDESTRUCTIVE NATURE OF PASD

While PASD is an effective test method, it would not be a viable

diagnostic if it were a destructive technique and degraded the 

properties of the wiring or connectors under evaluation. Therefore, a

series of experiments were conducted to carefully quantify PASD’s

impact on typical wiring insulation materials including Teflon®,

polypropylene, celluloid, and Mylar® [3].§** Several types of experiments were conducted to evaluate the impact of a PASD breakdown

on insulator surfaces. They included: (1) exposing the sample to a

series of PASD pulse breakdowns to evaluate whether the breakdown

Conductor

Conductor

nsulation

nsulation

Ground Plane

nsulatio Defects

(Cracks, Abrasion etc.)

Terminating

mpedance

does not

a f ect the

ASD

echnique

nsulator

Defect

Ground Plane

Transmitted

ulse

Reflected

ulse

ncident

ulse

Sensors

ASD

ulser

Damage Signature

elow Defect Detection Threshold

ime (10 Seconds)

0 10 20 30 40 50 60 70 0 90 100 

0

-1

-2

-3

A plit de (Volts)

Figure 2. The PASD Breakdown Can Occur Between Two Adjacent

Conductors With Insulation Damage, or from a Conductor to a

Ground Plane, Such as Braided Shielding.

Figure 3. PASD Diagnostic Concept for Locating Defects in Electrical

Wiring Systems. (A Single Conductor is Shown Under Test.)

Figure 4. PASD Waveforms from a Test of a Coaxial Cable with a Pin-Hole Defect in the Insulation that Extends to the Inner Conductor.
http://ammtiac.alionscience.com The AMMTIAC Quarterly, Volume 1, Number 2 5

voltage decreased with subsequent pulsing; (2) performing a slowly

rising DC breakdown test, applying a PASD pulse, and then repeating the DC breakdown test; and (3) determining the effect of high

energy discharges on low energy voltage breakdown strength. PASD

did not reduce the surface flashover strength of any of the materials

tested. The PASD arc breakdown process occurs very rapidly, with

the arc channel falling to 10% of its initial resistance value in approximately three nanoseconds. This is an important characteristic as it

improves PASD’s ability to locate defects. When exposed to slowly

rising DC after the application of the PASD pulse, the average breakdown voltages remained the same or actually increased. This is a

common high voltage conditioning phenomenon.

ABILITY OF PASD TO LOCATE AIRCRAFT WIRING DEFECTS

The PASD diagnostic has demonstrated that it can detect and 

locate chaffing, cracking, pin-holes and other breached insulation

defects under laboratory conditions and during testing at the 

FAA’s Airworthiness Assurance Nondestructive Inspection (NDI)

Validation Center (AANC) in Albuquerque, New Mexico [4].

These types of defects are documented in the Aging Transport 

Systems Rulemaking Advisory Committee (ATSRAC) publications:

Intrusive Inspection Final Report[5] and Aging Transport Systems 

Task 1 and 2 Final Report[6], which were comprehensive joint 

government-manufacturer-operator (industry) studies sponsored 

by the FAA.

Several types of defects were tested at the AANC test bed facility.

A mockup of an aircraft fuselage panel is shown in Figure 6 with a

variety of 10 foot wiring harnesses installed. Figure 7 shows the

results of an insulation chafe on a 10 foot wiring harness in the 

testbed. A 15 ft cable was used to isolate the 10 ft cable under evaluation. The PASD waveforms separate at 84.4 ns indicating the

presence of an insulation defect. The velocity of propagation in 

the cable under test can be easily measured or estimated and is typically 3 ns/foot for loosely bound wires. The fault location can be

readily calculated using the propagation velocity and injected pulse

width. PASD identified the defect at approximately 8.8 feet from

the injection end of the harness. The actual location of the defect

was at 8.0 feet.

Figure 8 shows PASD waveforms from tests on a 100 foot pair of

wires using a multipulse approach. In this example, an insulation

defect was present with a 1.0 mm air gap between two conductors

that resulted when a small amount of insulation had been stripped

away. The two waveforms deviate at the location of the defect, 246

nanoseconds down the line, which equates to 79.3 feet. The actual

location of the defect was at 80 feet. PASD located the defect to

within 8 inches in an 80 foot long section of wiring. This accuracy

would save significant maintenance time, especially if wiring is hidden behind panels or bulkheads as typically found in aircraft or

marine vessels, such as ships or submarines. The variations in the

waveforms in Figure 8 are caused by the varying impedance profile

down the harness. The nature of modest impedance variations in

Detectio Threshold 4.5kV - 5ns

Waveforms Differ Afte This Point

Solid Curve - Below Detectio Threshold Dashed Curve - At Detection Threshold

0 10 20 30 40 50 60 70 0 90 ime (10 conds)

.5

0.5

0

-0.5

-1

1.5

-2

A plit de (Volts)

Figure 5. PASD Waveforms from a Test of a Twisted Shielded Pair Cable. 

Figure 6. Mockup of an

Aircraft Fuselage Panel

with a Variety of 10 foot

Wiring Harnesses and

Connector Types. Each

Harness has Multiple

Documented Insulation

and Conductor Defects.

84.4 ns

-20 30 80 130 180

ime (10 Seconds)

0000.00

5000.00

0.00

5000.00

10000.00

15000.00

Amplitude (Arb) Figure 7. PASD Probe Waveforms for an Insulation Chafe Defect.

20 0 20 40 60 80 100 120 140 160 180 200 220 240 260 280 300 320

ime (10 Seconds)

Defect at 246 ns

20.00

5.00

0.00

5.00

0.00

-5.00

10.00

15.00

-20.00

Amplitude (Current) Figure 8. PASD Waveforms from a Test of a 100 Foot Wire Harness

with an Insulation Defect at 80 Feet.
6 The AMMTIAC Quarterly, Volume 1, Number 2

Larry Schneider is a Deputy Director at Sandia National Laboratories’ Pulsed Power Sciences Center. His group supports 

a broad portfolio of projects in high voltage pulsed power sciences, analytical and experimental electromagnetics, and 

particle accelerator systems development for Department of Energy National Security programs, other federal agencies, 

universities, and industry. He received his B.Sc. and M.Sc. in Electrical Engineering from Oregon State University in 1978 and

is a Registered Professional Engineer. 

wiring systems is not important, since PASD uses a differencing

technique to locate the defect.

PASD performed well against an array of challenges presented by

the AANC wiring test bed. A summary of testing results at the

AANC is shown in Table 1. With a 1 mm air gap, PASD found 12

out of 15 defects present, including challenging cracked insulator

defects. PASD was 100% effective in locating chafe and breach

defects with air gaps up to 1 mm. These results have not been

matched by other diagnostic techniques.

Table 1. Test Results at the FAA’s AANC Wiring Test Bed.

Gap Spacing†† Quantity Defects Detected Defects Undetected

Insulation Chafe Defect

1 mm Gap 7 7 0

3 mm Gap 5 3 2

Insulation Breach Defect

1 mm Gap 2 2 0

3 mm Gap 6 3 3

Cracked Insulation Defect

1 mm Gap 6 3 3

3 mm Gap 1 0 1

TOTAL 27 18 9

SUMMARY

PASD is effective at detecting and locating a variety of insulation

defects in complex wiring geometries. It is highly immune to line

impedance variations, an important property in aircraft or other

complex wiring systems, and has been shown to be nondestructive

to electrical insulation materials. Due to the simplicity of the PASD

concept, the low energy PASD pulser and diagnostics can be readily implemented into a portable diagnostic system. PASD shows

great promise as an effective diagnostic to find difficult to locate

insulation defects such as breached insulation, chaffing, and physically small insulation cracks. Although the PASD technique will

likely evolve as it enters into field applications (pulse shape, testing

strategy, etc.) it is capable of making a near-term impact on the ability of inspection and maintenance organizations to detect and locate

potentially hazardous insulation defects.

ACKNOWLEDGMENTS

The authors would like to acknowledge the Federal Aviation

Administration’s William J. Hughes Technology Center for supporting the development of PASD for application in commercial aircraft

wiring systems.

NOTES & REFERENCES

* There are typically many (up to 40) individual wires which form two wire

circuits.

† TDR is a method used to detect defects in an electrical transmission 

system (typically conductive wiring). A voltage is sent through the system

and the reflected signal is superimposed on the original to identify any

anomalies, which indicate the presence of defects.

‡ PASD can detect flaws of any size as long as the wire insulation is 

removed down to the inner conductor. The flaw, for example, could be

nearly invisible to the unassisted eye.

§ The effect of PASD on Kapton® insulation was not investigated. 

However, since the PASD pulse energy is very low, it is not expected to

damage this type of wire insulation.

** Teflon®, Mylar®, and Kapton® are registered trademarks of E.I. du Pont

de Nemours and Company

†† The gap spacing refers to the physical air gap from the exposed wire 

conductor to the nearest ground plane or adjacent grounded conductor.

[1] M.A. Dinallo and L.X Schneider, Pulsed Arrested Spark Discharge

(PASD) Diagnostic Technique for the Location of Defects in Aging Wiring 

System, Sandia National Laboratories Report, SAND2001-3225, October

2001

[2] L.X Schneider and R.K. Howard, Pulsed Arrested Spark Discharge

(PASD) Wiring Diagnostic, 8th Joint FAA/DoD/NASA Conference on

Aging Aircraft, February 2, 2005

[3] S.F. Glover, M.B. Higgins, G.E. Pena, and L.X Schneider, Assessment of 

the Non-Destructive Nature of PASD on Wire Insulation Integrity, Sandia

National Laboratories Report, SAND2003-3430, September 2003

[4] M.E. Dinallo, Aircraft Wire System Laboratory Development: Phase I

Progress Report, Sandia National Laboratories Report, SAND2003-2923,

August 2003

[5] Intrusive Inspection Final Report, sponsored by the Aging Transport 

Systems Rulemaking Advisory Committee as chartered by the FAA,

December 2000 

[6] Aging Transport Systems Task 1 and 2 Final Report, sponsored by the

Aging Transport Systems Rulemaking Advisory Committee as chartered by

the FAA, August 2000 

AMMTIAC ... accepts article submissions on subjects related to the scope of the IAC.

Please contact us for guidelines or to propose an idea.

ammtiac_news@alionscience.com
techsolutions 1

http://ammtiac.alionscience.com The AMMTIAC Quarterly, Volume 1, Number 2

INTRODUCTION

Nondestructive testing (NDT) is defined by the American

Society for Nondestructive Testing (ASNT) as: “The 

determination of the physical condition of an object without

affecting that object’s ability to fulfill its intended function.

Nondestructive testing techniques typically use a probing 

energy form to determine material properties or to indicate 

the presence of material discontinuities (surface, internal 

or concealed).” For the purpose of this article, the terms 

nondestructive testing, nondestructive inspection (NDI), 

and nondestructive evaluation (NDE) will be considered to 

be equivalent.

In the modern NDT paradigm, the uses of NDT can be

broken into several categories where it plays an important role:

• Material property measurements

• Process design for materials manufacturing

• Online process control

• Quality control as various stages of manufacturing 

are completed

In addition, NDT plays an important role in the continued

safe operation of physical assets. For instance, NDT is being

used in conventional inspections and in health monitoring,

where NDT sensors are embedded or attached to the system

being inspected or monitored for defects or damage. In all

cases, the customer must define the requirements of the test,

such as the minimum level of acceptability for the property

being measured and the characteristics of the material 

discontinuities to be identified. Given this information, the

NDT engineer or experienced Level III technician* can choose

the appropriate method and develop an appropriate technique

for the inspection requirements.

NONDESTRUCTIVE TESTING METHODS

An NDT method is classified according to its underlying 

physical principle. For example, the common methods are:

• Visual and optical testing (VT)

• Radiographic testing (RT)

• Electromagnetic testing (ET)

• Ultrasonic testing (UT)

• Liquid penetrant testing (PT)

• Magnetic particle testing (MT)

• Acoustic emission testing (AE)

• Infrared and thermal testing (IR)

An NDT technique defines all the parameters for the 

application of a specific method to a specific problem. These

parameters include the instruments, probes, acceptance criteria,

calibration specifications, and much more. ASNT offers a 

series of handbooks that are a key reference for the practical

implementation of NDT. In addition, AMMTIAC has a 

number of state-of-the-art reports and technology assessments

that provide in-depth reviews of specific topics. A listing of

these reports is available on the AMMTIAC website. The 

following sections will briefly describe each of the common

methods listed above.

Visual Testing

By far, the most common NDT method is visual and optical

testing. In many instances, a trained inspector armed with 

simple tools, such as a flashlight and magnifying glass, 

can perform a very effective inspection. In quality control, as

well as in maintenance operations, visual testing is the first 

line of defense. When deciding upon whether to use visual

testing, it is important to understand its potential as well 

as its limitations. If the visual method is not sufficient for the

problem at hand, more complex methods must be considered.

Using the visual inspection method for enclosed systems can

be challenging and possibly ineffective. To enable a technician

or engineer to inspect these difficult-to-see areas, a device

known as a borescope is often used. Borescopes are essentially

miniaturized cameras that can be placed on the end of a fiber

optic cable. The camera can then be inserted into regions 

that are obstructed from direct visual inspection, and the

resulting images are viewed in real-time on a video screen by

the inspector, as shown in Figure 1.

Radiography

Historically, radiography is the next most common NDT

method. Significant activity in the field occurred almost 

immediately after Roentgen’s discovery of X-rays in 1895 [1].

Early literature notes the ability of radiographs to detect 

discontinuities in castings, forgings, and welds in metals. 

Discontinuities such as pores or inclusions in metals are readily

detected in many cases. Cracks may also be detected using

radiographic techniques, but attention must be paid to 

orientation and residual stress issues. Radiography continues to

be widely used despite the expense and safety implications of

A Brief Introduction to Nondestructive Testing

As the inaugural edition of TechSolutions, this article provides an overview of nondestructive testing, a critical component of the broader

class of systems testing. While this first article gives a strategic introduction to the various nondestructive techniques currently available,

future editions of TechSolutions will engage the reader in a more detailed discussion of each of these methods and how they can be used 

to locate defects in various applications. Once the series on nondestructive methods is complete, we will combine all of the articles into 

a valuable desk reference on nondestructive testing. - Editor

7

David S. Forsyth

H. Thomas Yolken

George A. Matzkanin

TRI/Austin

Austin, TX
techsolutions 1

The AMMTIAC Quarterly, Volume 1, Number 2

the equipment. Recent advances in digital radiography 

have helped reduce the cost of employing this method 

by eliminating the use of film.

Electromagnetic Testing

Electromagnetic testing (ET), especially eddy current testing, is

commonly used to inspect objects throughout their life cycle.

Eddy current techniques employ alternating currents applied to

a conducting coil held close to the test object. In response, the

test object generates eddy currents to oppose the alternating

current in the coil. The eddy currents are then sensed by the

same coil, separate coils, or magnetic field sensors. Changes in

the induced eddy currents may be caused by changes to a 

material’s electromagnetic properties and/or changes in 

geometry, including the abrupt changes in current flow caused

by cracks. Thus ET methods are highly effective for the 

detection of cracks present on or below the surface of metallic

objects. ET equipment has become extremely portable and 

is relatively cheap. It is the second most common method 

specified for NDT of aircraft. Recent advances in eddy current

technology include multi-channel portable instruments, 

allowing faster inspections of large areas, and new magnetic

sensors, such as the giant magnetoresistive sensors (GMR)

developed for computer hard drives, instead of coils.

Ultrasonic Methods

Ultrasonic testing employs an extremely diverse set of 

methods based upon the generation and detection 

of mechanical vibrations or waves within test objects. The 

test objects are not restricted to metals, or even to solids. 

The term ultrasonic refers to sound waves of frequency above 

the limit of human hearing. Most ultrasonic techniques

employ frequencies in the range of 1 to 10 MHz. The velocity

of ultrasonic waves traveling through a material is a simple

function of the material’s modulus and density, and thus

ultrasonic methods are uniquely suited to materials 

characterization studies. In addition, ultrasonic waves are

strongly reflected at boundaries where material properties

change, and thus are often used for thickness measurements

and crack detection. Recent advances in ultrasonic techniques

have largely been in the field of phased array ultrasonics, 

now available in portable instruments. The timed or phased

firing of arrays of ultrasonic elements in a single transducer

allows for precise tailoring of the resulting ultrasonic waves

introduced into the test object.

Liquid Penetrant

Liquid penetrant methods are simple, and are commonly 

used for the detection of surface breaking discontinuities,

especially cracks. These methods involve the application of a

8

Figure 1. Air Force

Inspectors Use a

Borescope (Circled in

Red) to Inspect Engine

Components on a 

B1-B Lancer.

Figure 2. An Inspector Reviews a Digital X-ray on the Monitor.

Figure 3. A Bolt Hole

Eddy Current Inspection

Performed on an Aircraft.
http://ammtiac.alionscience.com The AMMTIAC Quarterly, Volume 1, Number 2 9

penetrant liquid to the test object, subsequent removal of

excess penetrant, and application of a developer to enhance

the visibility of remaining penetrant. Surface breaking cracks

may trap penetrant, and thus provide a visual indication of

the crack. Liquid penetrant methods are popular due to 

their simplicity and visual nature of the results. The process

parameters of penetrant and developer dwell time and 

cleaning are extremely important, and significant efforts 

continue to be expended to understand and optimize these

parameters. Liquid penetrant methods can be applied to 

virtually any material, but residual stress fields may close

cracks and reduce the effectiveness of these methods.

Magnetic Particle

Magnetic particle methods are based on the collection of 

loose magnetic particles at locations of magnetic flux leakage

on an object. This phenomenon is familiar to almost everyone

from childhood experiments with magnets and iron filings.

Magnetic particle methods are based on surface or near 

surface discontinuities that influence the electromagnetic

properties of the object under test. For these methods 

to be employed, the object under test must be electrically 

conductive and ferromagnetic. Magnetic particle techniques

thus allow the detection of surface-breaking cracks in steel

objects of complex geometry, which typically is a challenge for

RT methods. Figure 4 shows the inspection of a component

using a magnetic particle test.

Acoustic Emission

Acoustic emission (AE) methods rely on the use of passive 

sensors to “listen” for mechanical disturbances caused by various

degradation processes in test objects. In principle the AE method

is very simple, but in practice it can be difficult to separate the

vibrations caused by normal in-service processes from those 

associated with degradation and damage. Despite this difficulty,

AE methods are commonly used in certain niche applications,

such as the monitoring of pressure vessels. Space Shuttle flights

since the Columbia accident have included an AE-based system

on board to attempt to detect impacts to the leading edge of the

wing. Recent advances in AE include the miniaturization of the

associated electronics, allowing the development of relatively

small and light systems for use in applications such as on board 

the shuttle.

Infrared/Thermal Testing

Infrared and thermal testing methods are characterized by 

the use of thermal measurements of a test object as it 

undergoes a response to a stimulus. Thermal imaging cameras

are the most common sensing method. Passive imaging of

machinery or electronics may be used to detect hot spots

indicative of problems. Imaging of test objects after the 

application of energy can be used to monitor the flow of heat

in the object, which is a function of material properties as

well as boundaries. Flash thermography techniques have been

very successful in imaging disbonds and delaminations in

composite parts, for example. The high cost of quality 

thermal cameras was previously a drawback of the IR method,

but recently these have become significantly less expensive.

Another significant recent advancement is the use of 

mechanical energy to stimulate localized heating at subsurface

discontinuities, such as cracks in metals, opening up a new

field of application for the IR method.

SELECTING AND EVALUATING AN NDT METHOD 

AND TECHNIQUE

The selection of the appropriate method and development 

of the optimal technique to execute it is a crucial first step in

the use of NDT, and must be performed by appropriately

educated and experienced personnel. It is not sufficient 

to ask an inspector to “X-ray this part to see if it’s OK”. 

The relevant type of discontinuity, the material type, the 

manufacturing steps, and geometry are only some of the 

variables that affect the optimal choice. For a simplified guide,

refer to Table 1.

A DVANCED M ATERIALS , M ANUFACTURING AND T ESTING AMMTIAC

Figure 4. An 

Inspector Performing

a Magnetic Particle

Inspection of a 

Component.

est Object Material Discontinuity Type

erromagneti metal Surface-breaking cracks X X X X X X X

Non-surface-breaking cracks X X X X X X

Surface-breaking cracks X X X X X X

Non-surface-breaking cracks X X X X X

Co rosion pitting (hidde urface) X X X

Stress corrosio cracking*

Weld lack of penetration X X X

Weld porosity X X X

Delamination/disbonding X X X

orosity X X X

mpac Damage X X X X

X

Disbonds X X X

Voids/Porosity X X X

Density X X

Voids/Porosity X X X

Surface-breaking cracks X X X X

Non-surface-breaking cracks X X X X

*See non-surfac breaking cracks

olymers

Ceramics

Non-ferromagnetic metal

Meta generic)

olymer-matrix omposite

Cure

Visual a d Optical

Radiog aphy

Elect omag etic

Ult aso ic

Liquid Pe et a t

Mag etic Pa ticle

Acoustic Emissio

I f a ed a d The mal

Table 1. A Guide to Selection of NDT Methods for Various 

Materials and Discontinuities.
AMMT-019

10 The AMMTIAC Quarterly, Volume 1, Number 2

The above table demonstrates that many of the general

NDT methods can be applied to a wide variety of 

inspection problems. In practice, there are many mundane

but important criteria that will affect the optimal choice,

including equipment cost and availability, the availability 

of trained inspectors, time required to perform inspections,

and the tradeoff between time/cost and the required 

capability.

The quantitative evaluation of NDT capability is most

commonly made through the metric of probability of 

detection (POD). MIL-HDBK-1823 provides a widely

accepted method of estimating the POD for a specific NDT

technique as applied to a specific inspection problem. The

time and cost required to perform these studies can be 

significant, but this method is still widely used. It must be

emphasized that the use of proper technique documentation,

calibration procedures, and training are essential to ensure

that the carefully controlled data acquired in a POD study

can be reproduced in the actual service environment.

The study of the reliability of NDT is an active area

beyond the scope of this article. AMMTIAC has a long 

history of involvement in this field, and the interested reader

is referred to the Nondestructive Evaluation Capabilities

Data Book (AMMT-029) and the Technology Assessment 

of Probability of Detection for Nondestructive Evaluation

(AMMT-019) for more information [2,3].

THE FUTURE OF NDT

The evolution of a variety of technologies has enabled NDT

to move rapidly ahead in the last several years. Vastly

increased computing capability has enhanced the ability to

gather, store and manipulate data and images, and to 

partially or fully automate NDT equipment. Similarly,

NDT modeling has benefited from advances in computing

power. Commercial NDT modeling software is now 

available for use on personal computers and it continues 

to improve. 

The use of embedded sensors to monitor environments,

usage, and performance will continue to grow. Many 

of these sensor technologies are based on those long used 

in NDT, but many are also new. Advances in MicroElectroMechanical Systems (MEMS), fiber optics, 

power harvesting, and wireless communications will be

exploited to provide a continuous NDT system to 

supplement traditional periodic inspection scheduling.

It is impossible to provide more than a brief introduction

to the wide array of NDT possibilities in such a short 

article. In future issues of the AMMTIAC Quarterly, each

method will be described in more detail.

ACKNOWLEDGMENT

Photographs in this article were provided courtesy of the Air Force.

They are publicly available at http://www.af.mil/photos/.

NOTES & REFERENCES

*ASNT maintains a certification program for inspectors, with

grades Level I, II, and III, Level III being the highest grade.

[1] R.H. Bossi, F.A. Iddings, G.C. Wheeler, and P.O. Moore, 

Radiographic Testing, Nondestructive Testing Handbook (3rd. Ed.),

Volume 4, American Society for Nondestructive Testing, Columbus

OH, 2002

[2] W.D. Rummel and G.A. Matzkanin, Nondestructive Evaluation

Capabilities Data Book, 3rd Edition, Nondestructive Testing 

Information Analysis Center, AMMT-029, 1997

[3] G.A. Matzkanin and H.T. Yolken, A Technology Assessment 

of Probability of Detection for Nondestructive Evaluation,

Nondestructive Testing Information Analysis Center, 

AMMT-019, 2001

techsolutions 1

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AMMT-029
http://ammtiac.alionscience.com The AMMTIAC Quarterly, Volume 1, Number 2

INTRODUCTION

Today’s technology is compelling all sources to provide information electronically. The TEMS system (Total Electronic

Migration System), launched in 2004, is now ready for use in

gaining instant, electronic access to the DoD’s Scientific and

Technical Information (STI).

TEMS represents a long-term approach to providing access

to electronic documents. Each of the nine IACs sponsored by

the Defense Technical Information Center (DTIC) generates

and maintains a vast repository of information related to its

area of expertise. TEMS allows the IACs to store, search,

retrieve, and use STI in a convenient, centrally located 

database. It stores information in a wide range of formats,

including text, text and images, sound, and multimedia. TEMS

users can then perform simple or complex queries of the entire

IAC knowledge base, using any Web browser and running any

operating system. For full-text searching, TEMS provides a

simple search functionality similar to that found on many

Internet search pages. For a more complex, algorithmicallybased search, TEMS includes a function modeled on a commercial search engine.

USING TEMS

As of July 2006, TEMS had about 39,500 full documents

stored, and over 677,000 document citations for reference or

further request. This represents more than double the number

of document citations in the last year. The number of documents stored will increase soon, due to ongoing efforts to scan

documents and import them to TEMS.

To register to use TEMS, first go to www.dtic.mil and click

“Registration” at the bottom of the page. This brings you to a

page with instructions and information about the DTIC registration process. Once registered, you can search for documents

and citations using a wide range of TEMS search functions and

capabilities.

TEMS provides the tools to perform the following:

• Search all DTIC and individual IAC holdings using full

text and taxonomy search tools

• Choose the type of search mode, and:

• Utilize Boolean searches to locate information

• Perform a taxonomy search

• Perform a pattern search for a general subject area

• Perform a concept search on a single term

• Search using wild cards and special operators

• Perform an advanced search on multiple subject areas

• View the total number of results returned by a search

• View hits appearing in metadata from a search as 

bold, colored text

• Search full metadata and document text

• Display metadata with page of document

• Choose a result-presentation format

• Select document metadata, a single-page Portable Document Format (PDF), or an entire PDF document for

review

• Create, edit, and export bibliographies in various formats

• Save queries and bibliographies

The overall operation of TEMS encompasses individual 

IAC systems (so-called Mini-TEMS) and a centralized TEMS

(CTEMS). To populate TEMS, individual IACs scan their

paper documents into electronic format, and then enter metadata related to these documents into their local database (MiniTEMS). The IACs’ own Information Technology (IT) systems

interface with the CTEMS, which acts as an archive for data

repositories at the Mini-TEMS. Authorized users can access the

metadata and documents stored in CTEMS via the Internet.

“Information superiority is fundamental to the transformation of the operation abilities of the Joint Force. The Joint Force of 2020 will

use superior information and knowledge to achieve decision superiority, to support advanced command and control capabilities, and to

reach the full potential of dominant maneuver, precision, engagement, full dimension protection, and focused logistics. The breadth and

pace of this evolution demands flexibility and a readiness to innovate.” — Joint Vision 2020

11

Go to www.dtic.mil & click “Registration”

After becoming registered, visit https://tems-iac.dtic.mil/ to log in to TEMS.

To get started
12 The AMMTIAC Quarterly, Volume 1, Number 2

2006 USAF Aircraft Structural Integrity Program (ASIP) Conference

28 November – 30 November 2006

Hyatt Regency San Antonio

San Antonio, Texas

This annual conference is sponsored by the Materials and Manufacturing Directorate and the Air Vehicles Directorate of the Air Force Research Laboratory

(AFRL) and the Deputy for Engineering and the Agile Combat Support Systems

Wing of the Aeronautical Systems Center (ASC) at Wright-Patterson Air Force

Base, Ohio. It is intended to bring together world leaders in the area of aircraft

structural integrity and associated technologies to exchange information on the

latest developments in the design and acquisition of new aircraft systems and the

maintenance of aging aircraft systems in both military and commercial fleets.

This is an unclassified/unlimited attendance open Conference. It is being held

this year at the charming Hyatt Regency San Antonio in San Antonio, Texas during the exciting holiday season. This is the twenty-second year for this quality

technical Conference. It has become both nationally and internationally recognized as the most meaningful and useful Conference in this technical area during

the year. A large number of well-qualified technical personnel from all over the

world attend, bringing a broad perspective to the technology being discussed.

For more information, contact Dr. Joseph Gallagher, ASC/EN, WPAFB, OH at

(937) 255-5312, email joseph.gallagher@wpafb.af.mil or contact Universal Technology Corporation (UTC) at (937) 426-2808 and ask for the 2006 ASIP Conference desk, Fax (937) 426-8755, email jjennewine@utcdayton.com. Or visit the

web site at www.asipcon.com.

These users will have different levels of access: some will be able

to see actual scanned documents; others will be able to see only

the metadata about the documents and will have to use other

channels to request copies of these restricted access papers.

TEMS SEARCH CAPABILITY

TEMS allows users access to a sophisticated search engine.

With it, users can perform a concept, pattern, or Boolean

search over document collections from various sources. Users

can save search parameters and results for future reference and,

if they wish, even edit and re-execute the query later. What

makes this search engine unique is the concept search type. The

concept search analyzes query terms as units of meaning. When

a query is entered, the engine searches not only for exact word

matches, but also for related words or concepts. (This is called

“word expansion.”) This is possible due to the search engine’s

built-in “semantic network,” comprising approximately

285,000 word meanings and over 2.5 million expansion 

links between words, compiled from published electronic

dictionaries and other lexical sources. The engine can also analyze query terms as a pattern, which tolerates spelling differences in either the body of the text or the queries. This is

particularly useful in environments where documents have

scanning and Optical Character Reader (OCR) errors.

Because of these features, users do not have to build and

maintain complex knowledge-bases of their own to establish

relationships between topics, nor do they have to formulate

complex queries to find information that may be worded differently in the searched documents. In addition to its

unprecedented accuracy, the search engine is extremely easy

to use—a user may enter queries in plain English without 

any special operators, complex nesting of statements, or rigid

syntax.

TEMS is updated nightly to reflect new IAC holdings;

hence, IAC users have access to the newest, most current information regarding emerging technologies. The importance of

immediate access to IAC holdings for registered users cannot 

be overstated; IAC users can now immediately access reports

needed for research. Instead of waiting to receive a document

via mail to determine its relevance, users can now determine

that instantly, and utilize the information straight-away.

TEMS will improve the productivity of researchers, engineers, and program managers in the Defense community by

allowing them to acquire data in much shorter times than in

the past. Most importantly, TEMS now provides support to the

DoD community by enabling fast, real-time access to IAC document libraries by users who need this unique information to

fulfill their missions.
http://ammtiac.alionscience.com The AMMTIAC Quarterly, Volume 1, Number 2 13

The DoD Manufacturing Technology (ManTech) Program

focuses on the needs of weapon system programs for affordable,

low-risk development and production. It provides the crucial

link between technology invention and development, and

industrial applications. It matures and validates emerging manufacturing technologies to support low-risk implementation in

industry and DoD facilities. Investments are driven by defenseessential needs for: the ability to support six-sigma (low variability) manufacture, and maturation of process capabilities to

acceptable, quantified risk levels; unique production capability;

low-cost, high-quality manufacture; efficient factory operations

and supplier interaction; decoupling of unit cost from production volume; and efficient maintenance/repair processes and

rapid, low-cost spares acquisition.

The primary customers of the program are the acquisition

and logistics program managers responsible for transitioning

acquisition programs from development into production and

for the repair, maintenance, and overhaul of fielded systems.

Projects undertaken are beyond the normal risk or interest of

industry to pursue in a timely manner. The Program focuses on

manufacturing-related needs

that are pervasive across industry sectors and throughout the

weapon system life-cycle. The

primary benefit to the industrial

base comes from the emphasis

on transfer of the enhanced

technologies from the initial

demonstration application to

the rest of industry.

The program is executed with

a wide range of organizations,

including prime contractors, subcontractors, suppliers, hardware and software vendors, industrial consortia, centers of

excellence, universities, and research institutes, as well as collaboration with the Defense Logistics Agency (DLA), the Department of Commerce (DOC), and the Department of Energy

(DOE).

The Defense Manufacturing Conference (DMC) is the

annual forum for presenting and discussing initiatives aimed at

addressing DoD manufacturing and related sustainment/readiness needs. The conference is structured to provide participants

with an overview of DoD ManTech Programs, as well as

detailed technical discussions relating to the various initiatives

and technology thrusts being pursued. In the early 1970’s, the

conference was known as the ManTech Advisory Group, or

MTAG. Another productivity enhancement program known as

the Industrial Modernization Incentive Program, or IMIP, held

periodic conferences to discuss their initiatives with industry

and the Service program managers. In 1988, a decision was

made to combine these two meetings (MTAG and IMIP) into

a single conference. In 1992, this MTAG/IMIP Conference

evolved into the Defense Manufacturing Conference (DMC).

2006 DEFENSE MANUFACTURING CONFERENCE

The 2006 Defense Manufacturing Conference (DMC ’06) will

be held 27-30 November 2006 at the Gaylord Opryland Resort

and Convention Center in Nashville, Tennessee. It will be held

in conjunction with the Office of the Deputy Under Secretary

of Defense for Advanced Systems and Concepts, the Defense

Logistics Agency, the Missile Defense Agency and the Joint

Defense Manufacturing Technology Panel. Based on the

theme, “Superiority...Affordability...Can we really do

both?”, the agenda is structured

to bring together leaders from

government, industry and academia to exchange perspectives

and information about the

DoD Manufacturing Technology program, industrial base initiatives and related DoD

transformation initiatives. The DMC has become the principal

national forum for discussion of DoD industrial base policies,

programs and capabilities, as well as counterpart industry 

initiatives. Critical issues include key technology development

status, system/subsystem acquisition and sustainment affordability, diminishing supplier sources, assuring domestic technology transfer and the opportunity for greater use of

commercial industrial processes and business practices for

defense needs.
14 The AMMTIAC Quarterly, Volume 1, Number 2

SAMPE ‘06 Fall Technical Conference

“Global Advances in Materials and Process

Engineering”

11/06/06 - 11/09/06

Dallas, TX

Contact: SAMPE

1161 Park View Drive, Suite 200

Covina, CA 91724-3751 

Phone: 800.562.7360 x610

Fax: 626.332.8929

Web Link: www.sampe.org

National Nano Engineering 

Conference

11/09/06 - 11/10/06

Boston, MA

Contact: Ryan Bomba, ABP International

1466 Broadway, Suite 910

New York, NY 10036 

Phone: 212.490.3999 x5526

Fax: 212.986.7864

Email: ryan@abpi.net

Web Link: www.techbriefs.com/nano

2006 MSS National Symposium

11/13/06 - 11/16/06

Orlando, FL

Contact: Cheri Wiesman

Georgia Institute of Technology

Atlanta, GA 30332

Phone: 404.407.8379

Fax: 404.407.9376

Email: mss@gtri.gatech.edu 

Web Link: www.sensiac.gatech.edu

Aerospace Testing Expo 2006

11/14/06 - 11/16/06

Anaheim, CA

Contact: The Facet Company

14940 Cleat Street

Plymouth, MI 48170-6053 

Phone: 734.453.3500

Fax: 734.453.3843

Email: facet@facetcompany.com

Web Link: www.aerospacetesting.com/na

25th Army Science Conference (ASC)

“Transformational Army Science 

& Technology Charting the future 

of S&T for the Soldier”

11/27/06 - 11/30/06

Orlando, FL

Contact: Jean Thomas

TMC Design Corporation

16441 Benns Church Boulevard

Smithfield, VA 23430

Phone: 757.357.4011

Fax: 757.357.5108

Email: asc2006info@aol.com

Web Link: www.asc2006.com

2006 Defense Manufacturing 

Conference

11/27/06 - 11/30/06

Nashville, TN

Contact: DMC ‘06 Registration Desk

Universal Technology Corporation

1270 North Fairfield Road

Dayton, OH 45432

Phone: 937.426.2808

Fax: 937.426.8755

Email: meetings@utcdayton.com

Web Link: www.dmc.utcdayton.com

2006 USAF Aircraft Structural 

Integrity Program (ASIP) Conference

11/28/06 - 11/30/06

San Antonio, TX

Contact: Universal Technology Corporation

1270 North Fairfield Road

Dayton, OH 45432

Phone: 937.426.2808

Fax: 937.426.8755

Email: meeting@utcdayton.com

Web Link: www.asipcon.com

Smart Materials, Nano-,

& Micro-Smart Systems 2006

12/10/06 - 12/13/06

Adelaide, Australia

Contact: The International Society 

for Optical Engineering

PO Box 10

Bellingham, WA 98227-0010 

Phone: 888.504.8171

Fax: 360.647.1445

Email: spie@spie.org

http://spie.org/conferences/calls/06/au/

2007 U.S. Navy Cathodic 

Protection Conference

01/17/07 - 01/18/07

San Diego, CA

Contact: Andrew Seelinger, NAVSEA

Phone: 202.781.3670

Email: Andrew.Seelinger@navy.mil

Ship Tech 2007

01/30/07 - 01/31/07

Biloxi, MS

Contact: Tricia Wright

Concurrent Technologies Corporation

100 CTC Drive

Johnstown, PA 15904

Phone: 814.269.2567

Fax: 814.269.6800

Email: wright@ctc.com

Web Link: www.nmc.ctc.com

2007 Meeting of the Military Sensing

Symposia (MSS) - Specialty Groups on

Passive Sensors, Detectors, & Materials

02/05/07 - 02/09/07

Orlando, FL

Contact: SENSIAC Office

Georgia Institute of Technology

Atlanta, GA 30332

Phone: 404.407.7367

Fax: 404.407.9924

Email: mss@gtri.gatech.edu

Web Link: www.sensiac.gatech.edu

PACE 2007, Paint & Coatings Expo

02/11/07 - 02/14/07

Dallas, TX

Contact: Annette S. DeLorenzo, CMP

Director, PACE Meetings and Expositions

537 Stanton-Christiana Road, Suite 111

Newark, DE 19713 

Phone: 302.998.6550

Fax: 302.234.4608

Email: delorenzo@pace2006.com

Web Link: www.pace2007.com

Components for Military & Space 

Electronics Conference & Exhibition

(11th International CMSE Conference)

03/12/07 - 03/15/07

Los Angeles, CA

Contact: Leon Hamiter

Components Technology, Inc.

904 Bob Wallace Avenue, Suite 117

Huntsville, AL 35801 

Phone: 256.536.1304 

Fax: 256.539.8477

Email: lhamiter@cti-us.com 

Web Link: www.cti-us.com

SPIE Smart Structures & Materials 

& Nondestructive Evaluation & 

Health Monitoring 14th International

Symposium

03/18/07 - 03/22/07

San Diego, CA

Contact: The Intl Soc. for Optical Engineering

PO Box 10, Bellingham, WA 98227-0010

Phone: 360.676.3290

Fax: 360.647.1445

Email: spie@spie.org

Web Link: www.spie.org

38th Structures & Mechanical Behavior

Subcommittee, 25th Rocket Nozzle 

Technology Subcommittee, & 

16th Nondestructive Evaluation 

Subcommittee Joint Meeting

03/20/07 - 03/22/07

Newport, RI

Contact: Debra S. Eggleston

The Johns Hopkins University, CPIAC

10630 Little Patuxent Parkway, Suite 202

Columbia, MD 21044-3204

Phone: 410.992.7300

Fax: 410.730.4969

Email: dse@jhu.edu

Mark Your Calendar
http://ammtiac.alionscience.com The AMMTIAC Quarterly, Volume 1, Number 2 15

AMMTIAC Directory

TECHNICAL MANAGER/COR

Dr. Lewis E. Sloter II

Associate Director, Materials & Structures

ODUSD(S&T)/Weapons Systems

1777 North Kent Street, Ste 9030

Arlington, VA 22209-2110

(703) 588-7400, Fax: (703) 696-2230

Email: lewis.sloter@osd.mil

DEFENSE TECHNICAL INFORMATION CENTER

(DTIC) POC

Melinda Rozga, DTIC-I

8725 John J. Kingman Road, Ste 0944

Ft. Belvoir, VA 22060-6218

(703) 767-9122, Fax: (703) 767-9119

Email: mrozga@dtic.mil

AMMTIAC DIRECTOR

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