Federal Register / Vol. 74, No. 186 / Monday, September 28, 2009 / Notices 49363 

additional categories of awards, to 

recognize: Volunteer of the Year; Nongovernmental Organization of the Year; 

Excellence in Promoting Cultural & 

Ethnic Diversity; Excellence in Business 

Leadership; and the Susan Snow Cotter 

Award for Excellence in Ocean and 

Coastal Resource (NOAA re-named this 

award in honor of Susan Snow Cotter in 

2007). 

Affected Public: State, local and 

Tribal governments; not-for-profit 

institutions. 

Frequency: Biannually. 

Respondent’s Obligation: Voluntary. 

OMB Desk Officer: David Rostker, 

(202) 395–3897. 

Copies of the above information 

collection proposal can be obtained by 

calling or writing Diana Hynek, 

Departmental Paperwork Clearance 

Officer, (202) 482–0266, Department of 

Commerce, Room 7845, 14th and 

Constitution Avenue, NW., Washington, 

DC 20230 (or via the Internet at 

dHynek@doc.gov). 

Written comments and 

recommendations for the proposed 

information collection should be sent 

within 30 days of publication of this 

notice to David Rostker, OMB Desk 

Officer, FAX number (202) 395–7285, or 

David_Rostker@omb.eop.gov. 

Dated: September 22, 2009. 

Gwellnar Banks, 

Management Analyst, Office of the Chief 

Information Officer. 

[FR Doc. E9–23290 Filed 9–25–09; 8:45 am] 

BILLING CODE 3510–22–P 

DEPARTMENT OF COMMERCE 

International Trade Administration 

Application(s) for Duty–Free Entry of 

Scientific Instruments 

Pursuant to Section 6(c) of the 

Educational, Scientific and Cultural 

Materials Importation Act of 1966 (Pub. 

L. 89–651, as amended by Pub. L. 106– 

36; 80 Stat. 897; 15 CFR part 301), we 

invite comments on the question of 

whether instruments of equivalent 

scientific value, for the purposes for 

which the instruments shown below are 

intended to be used, are being 

manufactured in the United States. 

Comments must comply with 15 CFR 

301.5(a)(3) and (4) of the regulations and 

be postmarked on or before October 19, 

2009. Address written comments to 

Statutory Import Programs Staff, Room 

3720, U.S. Department of Commerce, 

Washington, D.C. 20230. Applications 

may be examined between 8:30 A.M. 

and 5:00 P.M. at the U.S. Department of 

Commerce in Room 3720. 

Docket Number: 09–051. Applicant: 

University of Notre Dame, 709 Grace 

Hall, Notre Dame, IN 46556. Instrument: 

Electron Microscope. Manufacturer: FEI 

Company, Czech Republic. Intended 

Use: The instrument will be used for the 

fabrication and characterization of 

nanostructures. This instrument 

provides the capability of both direct– 

write fabrication of nanotructures and 

nanomodified materials by using the 30 

keV Ga+ beam to remove material 

selectively or deposit material by ion– 

beam induced degradation of gas–phase 

precursors. Justification for Duty–Free 

Entry: No instruments of same general 

category are manufactured in the United 

States. Application accepted by 

Commissioner of Customs: August 31, 

2009. 

Docket Number: 09–052. Applicant: 

Youngstown State University, One 

University Plaza, Youngstown, OH 

44555. Instrument: Electron Microscope. 

Manufacturer: JEOL Ltd., Japan. 

Intended Use: The instrument will be 

used to study the nonstructural features 

of materials such as ceramic–metallic 

composite materials, and how they 

relate to macroscopic properties such as 

strength and resistance to corrosion. 

Justification for Duty–Free Entry: No 

instruments of same general category are 

manufactured in the United States. 

Application accepted by Commissioner 

of Customs: September 4, 2009. 

Docket Number: 09–053. Applicant: 

University of Notre Dame, 709 Grace 

Hall, Notre Dame, IN 46556. Instrument: 

Electron Microscope. Manufacturer: FEI 

Company, the Netherlands. Intended 

Use: The instrument will be used for the 

fabrication and characterization of 

nanostructures. This instrument 

provides the capability of both direct– 

write fabrication of nanotructures and 

nanomodified materials by using the 30 

keV Ga+ beam to remove material 

selectively or deposit material by ion– 

beam induced degradation of gas–phase 

precursors. Justification for Duty–Free 

Entry: No instruments of same general 

category are manufactured in the United 

States. Application accepted by 

Commissioner of Customs: September 9, 

2009. 

Docket Number: 09–054. Applicant: 

University of Nebraska Medical Center, 

986395 Nebraska Medical Center, 

Omaha, NE 68198. Instrument: Electron 

Microscope. Manufacturer: FEI 

Company, Czech Republic. Intended 

Use: The instrument will be used to 

study biological (e.g., human biopsy 

material and various animal tissues) as 

well as non–biological materials (e.g., 

nanoparticles). In studying these 

materials, the instrument will be used in 

techniques such as fixation, embedding, 

sectioning and staining. Justification for 

Duty–Free Entry: No instruments of 

same general category are manufactured 

in the United States. Application 

accepted by Commissioner of Customs: 

September 11, 2009. 

Dated: September 22, 2009. 

Christopher D. Cassel, 

Director. 

IA Subsidies Enforcement Office. 

[FR Doc. E9–23383 Filed 9–25–09; 8:45 am] 

BILLING CODE 3510–DS–S 

DEPARTMENT OF COMMERCE 

International Trade Administration 

National Renewable Energy 

Laboratory, et al. 

Notice of Decision on Application for 

Duty–Free Entry of an Electron 

Microscope 

This is a decision consolidated pursuant 

to Section 6(c) of the Educational, 

Scientific, and Cultural Materials 

Importation Act of 1966 (Pub. L. 89– 

651, as amended by Pub. L. 106–36; 80 

Stat. 897; 15 CFR part 301). Related 

records can be viewed between 8:30 

A.M. and 5:00 P.M. in Room 3705, U.S. 

Department of Commerce, 14th and 

Constitution Avenue., NW, Washington, 

D.C. 

Docket Number: 09–047. Applicant: 

Washington State University, Pullman, 

WA 99164. Instrument: Electron 

Microscope. Manufacturer: FEI 

Company, Czech Republic. Intended 

Use: See notice at 74 FR 44350, August 

28, 2009. 

Comments: None received. Decision: 

Approved. No instrument of equivalent 

scientific value to the foreign 

instrument, for such purposes as this 

instrument is intended to be used, was 

being manufactured in the United States 

at the time the instrument was ordered. 

Reasons: The foreign instrument is an 

electron microscope and is intended for 

research or scientific educational uses 

requiring an electron microscope. We 

know of no electron microscope or any 

other instrument suited to these 

purposes, which was being 

manufactured in the United States at the 

time of order of this instrument. 

Dated: September 22, 2009. 

Christopher D. Cassel, 

Director. 

Subsidies Enforcement Office. 

Import Administration. 

[FR Doc. E9–23384 Filed 9–25–09; 8:45 am] 

BILLING CODE 3510–DS–S 


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