[Federal Register Volume 74, Number 186 (Monday, September 28, 2009)]
[Notices]
[Page 49363]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E9-23383]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

Pursuant to Section 6(c) of the Educational, Scientific and Cultural 
Materials Importation Act of 1966 (Pub. L. 89-651, as amended by Pub. 
L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments on the 
question of whether instruments of equivalent scientific value, for the 
purposes for which the instruments shown below are intended to be used, 
are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations 
and be postmarked on or before October 19, 2009. Address written 
comments to Statutory Import Programs Staff, Room 3720, U.S. Department 
of Commerce, Washington, D.C. 20230. Applications may be examined 
between 8:30 A.M. and 5:00 P.M. at the U.S. Department of Commerce in 
Room 3720.
Docket Number: 09-051. Applicant: University of Notre Dame, 709 Grace 
Hall, Notre Dame, IN 46556. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument 
will be used for the fabrication and characterization of 
nanostructures. This instrument provides the capability of both direct-
write fabrication of nanotructures and nanomodified materials by using 
the 30 keV Ga+ beam to remove material selectively or deposit material 
by ion-beam induced degradation of gas-phase precursors. Justification 
for Duty-Free Entry: No instruments of same general category are 
manufactured in the United States. Application accepted by Commissioner 
of Customs: August 31, 2009.
Docket Number: 09-052. Applicant: Youngstown State University, One 
University Plaza, Youngstown, OH 44555. Instrument: Electron 
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument will be used to study the nonstructural features of 
materials such as ceramic-metallic composite materials, and how they 
relate to macroscopic properties such as strength and resistance to 
corrosion. Justification for Duty-Free Entry: No instruments of same 
general category are manufactured in the United States. Application 
accepted by Commissioner of Customs: September 4, 2009.
Docket Number: 09-053. Applicant: University of Notre Dame, 709 Grace 
Hall, Notre Dame, IN 46556. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument will be used for the fabrication and characterization of 
nanostructures. This instrument provides the capability of both direct-
write fabrication of nanotructures and nanomodified materials by using 
the 30 keV Ga+ beam to remove material selectively or deposit material 
by ion-beam induced degradation of gas-phase precursors. Justification 
for Duty-Free Entry: No instruments of same general category are 
manufactured in the United States. Application accepted by Commissioner 
of Customs: September 9, 2009.
Docket Number: 09-054. Applicant: University of Nebraska Medical 
Center, 986395 Nebraska Medical Center, Omaha, NE 68198. Instrument: 
Electron Microscope. Manufacturer: FEI Company, Czech Republic. 
Intended Use: The instrument will be used to study biological (e.g., 
human biopsy material and various animal tissues) as well as non-
biological materials (e.g., nanoparticles). In studying these 
materials, the instrument will be used in techniques such as fixation, 
embedding, sectioning and staining. Justification for Duty-Free Entry: 
No instruments of same general category are manufactured in the United 
States. Application accepted by Commissioner of Customs: September 11, 
2009.

    Dated: September 22, 2009.
Christopher D. Cassel,
Director.
IA Subsidies Enforcement Office.
[FR Doc. E9-23383 Filed 9-25-09; 8:45 am]
BILLING CODE 3510-DS-S