# Patent

## Title
Method and system for processing commonality of semiconductor devices

## Abstract

A method and system for processing commonality of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of measured values corresponding to a characteristic associated with the first plurality of semiconductor devices, obtaining a second plurality of measured values corresponding to the characteristic associated with the second plurality of semiconductor devices, performing a first statistical analysis for the first plurality of measured values, determining a first statistical distribution, performing a second statistical analysis for the second plurality of measured values, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator. Also, the method includes processing information associated with the indicator, determining a confidence level, processing information associated with the confidence level, and determining whether the characteristic is stable.

## Background
CROSS-REFERENCES TO RELATED APPLICATIONS
This application is a continuation of U.S. patent application Ser. No. 10/882,081, filed Jun. 29, 2004, now U.S. Pat. No. 7,003,430, which claims priority to Chinese Patent Application No. 200410025412.7, filed Jun. 14, 2004, entitled “Method and System for Processing Commonality of Semiconductor Devices,” by Inventors Eugene Wang and Jinghua Ni. Both applications are commonly assigned and incorporated by reference herein for all purposes.
The following three commonly-owned applications, including the parent application, were filed concurrently and are hereby incorporated by reference in their entirety for all purposes:
U.S. patent application Ser. No. 10/880,761, filed Jun. 29, 2004, now U.S. Pat. No. 6,965,844, in the name of Eugene Wang and Jinghua Ni, titled, “Method and System for Processing Stability of Semiconductor Devices”;
U.S. patent application Ser. No. 10/882,081, filed Jun. 29, 2004, now U.S. Pat. No. 7,003,430, in the name of Eugene Wang and Jinghua Ni, titled, “Method and System for Processing Commonality of Semiconductor Devices”; and
U.S. patent application Ser. No. 10/881,739, filed Jun. 29, 2004, now U.S. Pat. No. 7,024,334, in the name of Eugene Wang, titled, “Method and System for Yield Similarity of Semiconductor Devices”.


STATEMENT AS TO RIGHTS TO INVENTIONS MADE UNDER FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT
NOT APPLICABLE
REFERENCE TO A “SEQUENCE LISTING,” A TABLE, OR A COMPUTER PROGRAM LISTING APPENDIX SUBMITTED ON A COMPACT DISK
NOT APPLICABLE
BACKGROUND OF THE INVENTION
The present invention is directed to integrated circuits and their processing for the manufacture of semiconductor devices. More particularly, the invention provides a method and system for processing commonality of the manufacture of integrated circuits. Merely by way of example, the invention has been applied to certain quality characteristics for the manufacture of integrated circuits. But it would be recognized that the invention has a much broader range of applicability.
Integrated circuits or “ICs” have evolved from a handful of interconnected devices fabricated on a single chip of silicon to millions of devices. Current ICs provide performance and complexity far beyond what was originally imagined. In order to achieve improvements in complexity and circuit density (i.e., the number of devices capable of being packed onto a given chip area), the size of the smallest device feature, also known as the device “geometry”, has become smaller with each generation of ICs. Semiconductor devices are now being fabricated with features less than a quarter of a micron across.
Increasing circuit density has not only improved the complexity and performance of ICs but has also provided lower cost parts to the consumer. An IC fabrication facility can cost hundreds of millions, or even billions, of dollars. Each fabrication facility will have a certain throughput of wafers, and each wafer will have a certain number of ICs on it. Therefore, by making the individual devices of an IC smaller, more devices may be fabricated on each wafer, thus increasing the output of the fabrication facility. Making devices smaller is very challenging, as each process used in IC fabrication has a limit. That is to say, a given process typically only works down to a certain feature size, and then either the process or the device layout needs to be changed. An example of such a limit is processing commonality between different production lines or different production sites.
Fabrication of custom integrated circuits using chip foundry services has evolved over the years. Fabless chip companies often design the custom integrated circuits. Such custom integrated circuits require a set of custom masks commonly called “reticles” to be manufactured. A chip foundry company called Semiconductor International Manufacturing Company (SMIC) of Shanghai, China is an example of a chip company that performs foundry services. Although fabless chip companies and foundry services have increased through the years, many limitations still exist. For example, a chip company usually utilizes several separate manufacturing sites. To flexibly use the capacity at each site, the company may distribute a single large order to several sites which may simultaneously manufacture the same kind of product. Additionally, to avoid any supply discontinuity caused by an unexpected accident in a manufacturing process, customers may request their products being qualified and manufactured on several lines or at several sites. If one site experiences certain problems, the loading can be immediately moved to other sites. Therefore the risk to the customers in supply lines is significantly reduced. Although the various production sites are usually built at different periods of time, and the tools equipped may be different from each other, the final products from different sites should bear similar quality and functionality. These and other limitations are described throughout the present specification and more particularly below.
From the above, it is seen that an improved technique for processing semiconductor devices is desired.
BRIEF SUMMARY OF THE INVENTION
The present invention is directed to integrated circuits and their processing for the manufacture of semiconductor devices. More particularly, the invention provides a method and system for processing commonality of the manufacture of integrated circuits. Merely by way of example, the invention has been applied to certain quality characteristics for the manufacture of integrated circuits. But it would be recognized that the invention has a much broader range of applicability.
In a specific embodiment, the invention provides a method for processing commonality of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of measured values corresponding to a characteristic associated with the first plurality of semiconductor devices, and obtaining a second plurality of measured values corresponding to the characteristic associated with the second plurality of semiconductor devices. Additionally, the method includes performing a first statistical analysis for the first plurality of measured values, determining a first statistical distribution based on at least information associated with the first statistical analysis, performing a second statistical analysis for the second plurality of measured values, and determining a second statistical distribution based on at least information associated with the second statistical analysis. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator based on at least information associated with the first statistical distribution and the second statistical distribution. The indicator is associated with an overlapping area between the first statistical distribution and the second statistical distribution. Also, the method includes processing information associated with the indicator, determining a confidence level based on at least information associated with the indicator, processing information associated with the confidence level, and determining whether the characteristic is stable based on at least information associated with the confidence level. The confidence level is associated with a second order of the indicator and a first order of the indicator. The determining whether the characteristic is stable includes if the confidence level is equal to or higher than 95%, determining the characteristic to be common, and if the confidence level is lower than 95%, determining the characteristic to be not common.
According to another embodiment, a computer-readable medium including instructions for processing commonality of semiconductor devices. The computer-readable medium includes one or more instructions for receiving a first plurality of measured values corresponding to a characteristic associated with the first plurality of semiconductor devices, one or more instructions for receiving a second plurality of measured values corresponding to the characteristic associated with the second plurality of semiconductor devices, one or more instructions for performing a first statistical analysis for the first plurality of measured values, and one or more instructions for determining a first statistical distribution based on at least information associated with the first statistical analysis. Additionally, the computer-readable medium includes one or more instructions for performing a second statistical analysis for the second plurality of measured values, one or more instructions for determining a second statistical distribution based on at least information associated with the second statistical analysis, one or more instructions for processing information associated with the first statistical distribution and the second statistical distribution, and one or more instructions for determining an indicator based on at least information associated with the first statistical distribution and the second statistical distribution. The indicator is associated with an overlapping area between the first statistical distribution and the second statistical distribution. Moreover, the computer-readable medium includes one or more instructions for processing information associated with the indicator, one or more instructions for determining a confidence level based on at least information associated with the indicator, one or more instructions for processing information associated with the confidence level, and one or more instructions for determining whether the characteristic is stable based on at least information associated with the confidence level. The confidence level is associated with a second order of the indicator and a first order of the indicator. The one or more instructions for determining whether the characteristic is stable includes one or more instructions for if the confidence level is equal to or higher than 95%, determining the characteristic to be common, and one or more instructions for if the confidence level is lower than 95%, determining the characteristic to be not common.
Many benefits are achieved by way of the present invention over conventional techniques. For example, the present technique provides an easy to use process that relies upon conventional technology. In some embodiments, the method provides reliable determination of product commonality between different production lines or different production sites. For example, the product commonality is assessed between a baseline process and a non-baseline process. Additionally, the method provides a process that is compatible with conventional process technology without substantial modifications to conventional equipment and processes. Depending upon the embodiment, one or more of these benefits may be achieved. These and other benefits will be described in more throughout the present specification and more particularly below.
Various additional objects, features and advantages of the present invention can be more fully appreciated with reference to the detailed description and accompanying drawings that follow.



BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a simplified method for processing commonality of semiconductor manufacture according to an embodiment of the present invention
FIG. 2 is a simplified harmonization confidence as a function of two statistical parameters.



DETAILED DESCRIPTION OF THE INVENTION
The present invention is directed to integrated circuits and their processing for the manufacture of semiconductor devices. More particularly, the invention provides a method and system for processing commonality of the manufacture of integrated circuits. Merely by way of example, the invention has been applied to certain quality characteristics for the manufacture of integrated circuits. But it would be recognized that the invention has a much broader range of applicability.
FIG. 1 is a simplified method for processing commonality of semiconductor manufacture according to an embodiment of the present invention. This diagram is merely an example, which should not unduly limit the scope of the claims herein. The method 100 includes the following processes:

    
    
        1. Process 110 for making first plurality of semiconductor devices;
        2. Process 115 for making second plurality of semiconductor devices;
        3. Process 120 for characterizing first plurality of semiconductor devices;
        4. Process 125 for characterizing second plurality of semiconductor devices;
        5. Process 130 for analyzing characteristic of first plurality of semiconductor devices;
        6. Process 135 for analyzing characteristic of second plurality of semiconductor devices;
        7. Process 140 for comparing characteristics
        8. Process 150 for determining harmonization confidence;
        9. Process 160 for determining commonality.
    
    


The above sequence of processes provides a method according to an embodiment of the present invention. Other alternatives can also be provided where processes are added, one or more processes are removed, or one or more processes are provided in a different sequence without departing from the scope of the claims herein. Future details of the present invention can be found throughout the present specification and more particularly below.
At the process 110, a first plurality of semiconductor devices is fabricated. The semiconductor devices may include various types of transistors, diodes, resistors, inductors, or others. Additionally, the semiconductor devices may include starting products or intermediate products of transistors, diodes, resistors, inductors, or others. In one embodiment, the fabrication of a transistor starts with a starting product and includes various processing steps. For example, the starting product includes a semiconductor substrate. The semiconductor may be silicon, germanium, gallium arsenide, or other material. The processing steps may include deposition, anneal, ion implantation, etching, or other. After each processing step, the resulting structure is an intermediate product.
At the process 115, a second plurality of semiconductor devices is fabricated. By design, the second plurality of semiconductor devices has at least one characteristic the same as the first plurality of semiconductor devices. In one embodiment, the characteristic is an in-line process parameter. For example, the characteristic is width of polysilicon layer, deposition thickness, or metal critical dimension. In another embodiment, the characteristic is a device or wafer acceptance parameter. For example, the characteristic is sheet resistance or breakdown voltage. In yet another embodiment, the second plurality of semiconductor devices has the same structural and functional specifications as the first plurality of semiconductor devices. For example, the second plurality of semiconductor devices by design are made with starting structures and fabrication processes the same as ones for the first plurality of semiconductor devices.
Additionally, the first plurality of semiconductor devices is made on a first production line or at a first production site, and the second plurality of semiconductor devices is made on a second production line or at a second production site. For example, the first production line and the second production line are within the same production site or belong to different production sites. In one embodiment, the first production line and the second production line share at least some fabrication tools. In another embodiment, the first production line and the second production line do not share any fabrication tool. In yet another embodiment, the first production site and the second production site both use certain types of fabrication tools. For example, an anneal chamber used at the first production site has a model number that is the same as at the second production site. In yet another embodiment, the first production site and the second production site do not both use any same type of fabrication tool. For example, an anneal chamber used at the first production site is made by a manufacturer different from one at the second production site.
Moreover, the first production line or the first production site provides a based line fabrication process according to an embodiment of the present invention. For example, a company may design and qualify a new product at its research and development center and then fan out the new product into several manufacturing sites for mass production. The performance record at the research and development center is the baseline. In another example, the company chooses a baseline site with best performance among several production sites.
Also, in another embodiment, a company harmonizes different manufacturing sites. For example, a control board is established for leading the task. Starting from unifying nomenclature rules, all sites use a common process flow when manufacturing a same specific product. The differences in tools at different sites are analyzed and reduced before, after, or during the method 100 is performed.
At the process 120, the first plurality of semiconductor devices is characterized. In one embodiment, a certain structural and functional parameter is measured for some or all of the first plurality of semiconductor devices. For example, the structural parameter is a dimension of a deposited layer, such as width of polysilicon layer, deposition thickness, or metal critical dimension. In another example, the structural parameter is a doping profile, a mobility profile, a stress profile, or other. In yet another embodiment, the function parameter is sheet resistance, turn-on voltage, breakdown voltage, leakage current, or other. In another embodiment, more than one structural and functional parameter is measured for some or all of the first plurality of semiconductor devices. In yet another embodiment, one or more parameters associated with the first plurality of semiconductor devices including or other than one or more structural and function parameters are measured for some or all of the first plurality of semiconductor devices. Additionally, as discussed above, some or all of the first plurality of semiconductor devices are characterized. For example, the characterized semiconductor devices are selected from the first plurality of semiconductor devices randomly or based on a first predetermined condition.
At the process 125, the second plurality of semiconductor devices is characterized. One or more parameters determined for the first plurality of semiconductor devices are also measured for some or all of the first plurality of semiconductor devices. According to one embodiment, the characterized semiconductor devices are selected from the second plurality of semiconductors randomly or based on a second predetermined condition. For example, the second predetermined condition may be the same or different from the first predetermined condition.
At the process 130, the characteristic of the first plurality of semiconductor devices is analyzed. In one embodiment, the one or more parameters measured for some or all of the first plurality of semiconductor devices are processed statistically. For example, the measured values are modeled with a symmetric bell shaped normal distribution N(μ1, σ12) μ1 is a mean parameter and σ1 is a standard deviation parameter for some or all of the first plurality of semiconductor devices. In another example, the measured values are analyzed with a statistical model other than the normal distribution.
At the process 135, the characteristic of the second plurality of semiconductor devices is analyzed. In one embodiment, the one or more parameters measured for some or all of the second plurality of semiconductor devices are processed statistically. For example, the measured values are modeled with a symmetric bell shaped normal distribution N(μ2, σ22). μ2 is a mean parameter and σ2 is a standard deviation parameter for some or all of the second plurality of semiconductor devices. In another example, the measured values are analyzed with a statistical model other than the normal distribution. The statistical model is the same as one used of the first plurality of semiconductor devices with the same or different values for statistical parameters used.
At the process 140, the characteristics of the first plurality of semiconductor devices and the second plurality of semiconductor devices are compared. In one embodiment, the measured values for the first plurality of semiconductor devices are modeled with N(μ1, σ12), and the measured values for the second plurality of semiconductor devices are modeled with N(μ2, σ22). Through a mathematical transformation, the normal distribution for the first plurality of semiconductor devices is converted to a standard normal distribution N(0, 1). The standard normal distribution has a mean value of zero and a standard deviation parameter of one. The same mathematical transformation converts the normal distribution of the second plurality of semiconductor devices to another normal distribution N(μ3, σ32), where




  
    
      
        
          μ
          3
        
        =
        
          
            1
            
              σ
              1
            
          
          ⁢
          
            (
            
              
                μ
                2
              
              -
              
                μ
                1
              
            
            )
          
        
      
    
    
      
        (
        
          Equation
          ⁢
          
            
          
          ⁢
          1
        
        )
      
    
  
  
    
      
        
          σ
          3
        
        =
        
          
            σ
            2
          
          
            σ
            1
          
        
      
    
    
      
        (
        
          Equation
          ⁢
          
            
          
          ⁢
          2
        
        )
      
    
  




According to one embodiment of the present invention, the comparison between the characteristics of the first plurality and the second plurality of semiconductor devices is measured by the overlapping area of the standard normal distribution N(0, 1) and N(μ3, σ32) between the interested interval (−3, 3). Specifically, the overlapping area is determined as follows:




  
    
      
        
          A
          ⁡
          
            (
            
              
                μ
                3
              
              ,
              
                σ
                3
              
            
            )
          
        
        =
        
          
            (
            
              
                ∫
                
                  -
                  3
                
                3
              
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                  [
                  
                    
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                        3
                      
                    
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                              (
                              
                                y
                                -
                                
                                  μ
                                  3
                                
                              
                              )
                            
                            2
                          
                          
                            2
                            ⁢
                            
                              σ
                              3
                              2
                            
                          
                        
                      
                    
                  
                  ⁢
                  
                    
                  
                  ]
                
                ⁢
                
                  d
                  y
                
              
            
            )
          
          /
          
            
              ∫
              
                -
                3
              
              3
            
            ⁢
            
              
                e
                
                  -
                  
                    
                      y
                      2
                    
                    2
                  
                
              
              ⁢
              
                
              
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                y
              
            
          
        
      
    
    
      
        (
        
          Equation
          ⁢
          
            
          
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At the process 150, harmonization confidence is determined. For example, the harmonization confidence is defined as follows.

HC2=(−0.56A2+1.56A)×100%  (Equation 4)

where HC2 is the harmonization confidence in percentage. For example, if A is 0.8, HC2 would equal 88.96%. According to one embodiment of the present invention, HC2 is associated with the degree of commonality of a product characteristic from the first production line or the first production site and from the second production line or the second production site. As shown in Equation 4, the harmonization confidence is a binary function of μ3 and σ3. FIG. 2 is a simplified harmonization confidence as a function of μ3 and σ3. This diagram is merely an example, which should not unduly limit the scope of the claims. One of ordinary skill in the art would recognize many variations, alternatives, and modifications. As shown in FIG. 2, μ3 varies from 0 to 6 in the rows and σ3 varies from 0.1 to 6 in the columns. The harmonization confidence is symmetric to 0 with respect to μ3, so the table also covers μ3 values ranging from 0 to −6. The process 150 may be performed by using the table in FIG. 2.
At the process 160, the commonality of a product characteristic is determined based on the harmonization confidence. For example, if the harmonization confidence is higher than or equal to 95%, the product characteristic is considered common between different production lines or different production sites. In another example, if the harmonization confidence is higher than or equal to 99%, the product characteristic is considered highly common between different production lines or different production sites. In yet another example, if the harmonization confidence is higher than 100%, the product characteristic from the second production line or the second production site has a variation less than ones from the first production line or the first production site. In one embodiment, the first production line or the first production site represents a baseline process. The non-baseline process has a performance better than the baseline process with respect to the specific product characteristic under examination. If the non-baseline process has a majority of product characteristics receiving HC2 greater than 100%, the non-baseline process may be designated as a new baseline process.
In another embodiment, if a product characteristic is not considered to be common, the product performance may vary significantly from one production line to another production line, or from one production site to another production site. Such variation may have an adverse impact on system integration and limit the use of such product in critical applications with a narrow tolerance. In yet another embodiment, if a product characteristic is considered to be highly common, the product performance remains substantially the same among different production lines or different production sites. Such product may be preferred for critical applications.
As discussed above and further emphasized here, FIG. 1 is merely an example, which should not unduly limit the scope of the claims. One of ordinary skill in the art would recognize many variations, alternatives, and modifications. In one embodiment, the product parameter measured and analyzed by the method 100 is any quality characteristic. For example, the product parameter is a physical characteristic, such as length, weight, pressure, voltage, current, or viscosity. In another example, the product parameter is a sensory characteristic, such as taste, color, or easiness of use. In yet another example, the product parameter is a time-dependant characteristic, such as reliability or durability. In another embodiment, the method 100 is applied to any product and not limited to semiconductor devices.
In one embodiment of the present invention, some or all processes of the method 100 can be performed by a computer system. For example, a computer program product includes a computer-readable medium including instructions for processing commonality of semiconductor devices. The computer-readable medium includes one or more instructions for processing commonality of semiconductor devices. The computer-readable medium includes one or more instructions for receiving a first plurality of measured values corresponding to a characteristic associated with the first plurality of semiconductor devices, one or more instructions for receiving a second plurality of measured values corresponding to the characteristic associated with the second plurality of semiconductor devices, one or more instructions for performing a first statistical analysis for the first plurality of measured values, and one or more instructions for determining a first statistical distribution based on at least information associated with the first statistical analysis. Additionally, the computer-readable medium includes one or more instructions for performing a second statistical analysis for the second plurality of measured values, one or more instructions for determining a second statistical distribution based on at least information associated with the second statistical analysis, one or more instructions for processing information associated with the first statistical distribution and the second statistical distribution, and one or more instructions for determining an indicator based on at least information associated with the first statistical distribution and the second statistical distribution. The indicator is associated with an overlapping area between the first statistical distribution and the second statistical distribution. Moreover, the computer-readable medium includes one or more instructions for processing information associated with the indicator, one or more instructions for determining a confidence level based on at least information associated with the indicator, one or more instructions for processing information associated with the confidence level, and one or more instructions for determining whether the characteristic is stable based on at least information associated with the confidence level. The confidence level is associated with a second order of the indicator and a first order of the indicator. The one or more instructions for determining whether the characteristic is stable includes one or more instructions for if the confidence level is equal to or higher than 95%, determining the characteristic to be common, and one or more instructions for if the confidence level is lower than 95%, determining the characteristic to be not common.
For example, the confidence level is equal to a percentage number associated with a sum of the second order of the indicator multiplied by −0.56 and the first order of the indicator multiplied by 1.56. The one or more instructions for determining whether the characteristic is common includes one or more instructions for if the confidence level is equal to or higher than 99%, determining the characteristic to be highly common. The one or more instructions for determining whether the characteristic is common further includes the one or more instructions for if the confidence level is higher than 100%, determining the characteristic associated with the second plurality of semiconductor products to be more stable than the characteristic associated with the first plurality of semiconductor products. In another example, the indicator is dependent upon only a first statistical parameter and a second statistical parameter. The one or more instructions for determining a confidence level includes one or more instructions for obtaining the confidence level from a table. The table provides the confidence level as a function of the first statistical parameter and the second statistical parameter. The indicator is dependent upon only a first statistical parameter and a second statistical parameter. The first statistical parameter is proportional to a difference between a first mean and a second mean, and the second statistical parameter is associated with a ratio between a first standard deviation and a second standard deviation. The first statistical distribution is a first normal distribution associated with the first mean and the first standard deviation, and a second statistical distribution is a second normal distribution associated with the second mean and the second standard deviation. In yet another example, the first plurality of semiconductor devices is associated with a first production line, and the second plurality of semiconductor devices is associated with a second production line. The first production line is associated with a baseline process.
It is also understood that the examples and embodiments described herein are for illustrative purposes only and that various modifications or changes in light thereof will be suggested to persons skilled in the art and are to be included within the spirit and purview of this application and scope of the appended claims.

## Claims

1. A method for determining commonality of semiconductor devices, the method comprising:
providing a first plurality of semiconductor devices;
providing a second plurality of semiconductor devices;
obtaining a first plurality of measured values corresponding to a characteristic associated with the first plurality of semiconductor devices;
obtaining a second plurality of measured values corresponding to the characteristic associated with the second plurality of semiconductor devices
performing a first statistical analysis for the first plurality of measured values;
determining a first statistical distribution based on at least information associated with the first statistical analysis;
performing a second statistical analysis for the second plurality of measured values;
determining a second statistical distribution based on at least information associated with the second statistical analysis;
processing information associated with the first statistical distribution and the second statistical distribution;
determining an indicator based on at least information associated with the first statistical distribution and the second statistical distribution, the indicator being associated with an overlapping area between the first statistical distribution and the second statistical distribution;
processing information associated with the indicator;
determining whether there is a commonality associated with the first plurality of semiconductor devices and the second plurality of semiconductor devices based on at least information associated with the indicator.

2. The method of claim 1 wherein the determining whether there is a commonality associated with the first plurality of semiconductor devices and the second plurality of semiconductor devices comprises:
determining a confidence level based on at least information associated with the indicator;
processing information associated with the confidence level;
determining whether the measured values associated with the characteristic are stable based on at least information associated with the confidence level.

3. The method of claim 2 wherein the confidence level is associated with a second order of the indicator and a first order of the indicator.

4. The method of claim 2 wherein the determining whether the measured values associated with the characteristic are stable based on at least information associated with the confidence level comprises:
if the confidence level is equal to or higher than 95%, determining the measured values associated with the characteristic to be common;
if the confidence level is lower than 95%, determining the measured values associated with the characteristic to be not common.

5. The method of claim 2 wherein:
the indicator is dependent upon only a first statistical parameter and a second statistical parameter;
the determining a confidence level includes obtaining the confidence level from a table, the table providing the confidence level as a function of the first statistical parameter and the second statistical parameter.

6. The method of claim 1 wherein the first statistical distribution is a first normal distribution associated with a first mean and a first standard deviation, and the second statistical distribution is a second normal distribution associated with a second mean and a second standard deviation.

7. The method of claim 6 wherein the indicator is dependent upon only a first statistical parameter and a second statistical parameter, the first statistical parameter being proportional to a difference between the first mean and the second mean, the second statistical parameter being associated with a ratio between the first standard deviation and the second standard deviation.

8. The method of claim 1 wherein the first plurality of semiconductor devices is associated with a first production line, and the second plurality of semiconductor devices is associated with a second production line.

9. The method of claim 8 wherein the first production line is associated with a baseline process.

10. The method of claim 1 wherein the characteristic is either a structural parameter or a functional parameter.

11. A computer-readable storage medium including a plurality of instructions for determining commonality of semiconductor devices, the plurality of instructions executable by a processor and comprising:
one or more instructions for providing a first plurality of semiconductor devices;
one or more instructions for providing a second plurality of semiconductor devices;
one or more instructions for obtaining a first plurality of measured values corresponding to a characteristic associated with the first plurality of semiconductor devices;
one or more instructions for obtaining a second plurality of measured values corresponding to the characteristic associated with the second plurality of semiconductor devices;
one or more instructions for performing a first statistical analysis for the first plurality of measured values;
one or more instructions for determining a first statistical distribution based on at least information associated with the first statistical analysis;
one or more instructions for performing a second statistical analysis for the second plurality of measured values;
one or more instructions for determining a second statistical distribution based on at least information associated with the second statistical analysis;
one or more instructions for processing information associated with the first statistical distribution and the second statistical distribution;
one or more instructions for determining an indicator based on at least information associated with the first statistical distribution and the second statistical distribution, the indicator being associated with an overlapping area between the first statistical distribution and the second statistical distribution;
one or more instructions for processing information associated with the indicator;
one or more instructions for determining whether there is a commonality associated with the first plurality of semiconductor devices and the second plurality of semiconductor devices based on at least information associated with the indicator.

12. The computer-readable storage medium of claim 11 wherein the one or more instructions for determining whether there is a commonality associated with the first plurality of semiconductor devices and the second plurality of semiconductor devices comprises:
one or more instructions for determining a confidence level based on at least information associated with the indicator;
one or more instructions for processing information associated with the confidence level;
one or more instructions for determining whether measured values associated with the characteristic is stable based on at least information associated with the confidence level.

13. The computer-readable storage medium of claim 12 wherein the confidence level is associated with a second order of the indicator and a first order of the indicator.

14. The computer-readable storage medium of claim 12 wherein the one or more instructions for determining whether the measured values associated with the characteristic are stable based on at least information associated with the confidence level comprises:
one or more instructions for if the confidence level is equal to or higher than 95%, determining the measured values associated with the characteristic to be common;
one or more instructions for if the confidence level is lower than 95%, determining the measured values associated with the characteristic to be not common.

15. The computer-readable storage medium of claim 12 wherein:
the indicator is dependent upon only a first statistical parameter and a second statistical parameter;
one or more instructions for the determining a confidence level includes one or more instructions for obtaining the confidence level from a table, the table providing the confidence level as a function of the first statistical parameter and the second statistical parameter.

16. The computer-readable storage medium of claim 11 wherein the first statistical distribution is a first normal distribution associated with a first mean and a first standard deviation, and the second statistical distribution is a second normal distribution associated with a second mean and a second standard deviation.

17. The computer-readable storage medium of claim 16 wherein the indicator is dependent upon only a first statistical parameter and a second statistical parameter, the first statistical parameter being proportional to a difference between the first mean and the second mean, the second statistical parameter being associated with a ratio between the first standard deviation and the second standard deviation.

18. The computer-readable storage medium of claim 11 wherein the first plurality of semiconductor devices is associated with a first production line, and the second plurality of semiconductor devices is associated with a second production line.

19. The computer-readable storage medium of claim 18 wherein the first production line is associated with a baseline process.

20. The computer-readable storage medium of claim 11 wherein the characteristic is either a structural parameter or a functional parameter.