This section of the FEDERAL REGISTER

contains documents other than rules or

proposed rules that are applicable to the

public. Notices of hearings and investigations,

committee meetings, agency decisions and

rulings, delegations of authority, filing of

petitions and applications and agency

statements of organization and functions are

examples of documents appearing in this

section.

Notices Federal Register

82372 

Vol. 75, No. 250 

Thursday, December 30, 2010 

DEPARTMENT OF COMMERCE 

Foreign-Trade Zones Board 

[Docket 70–2010] 

Foreign-Trade Zone 158—Vicksburg/ 

Jackson, MS; Application for 

Expansion 

Correction 

In notice document 2010–31877 

beginning on page 79335 in the issue of 

Monday, December 20, 2010, make the 

following correction: 

The subject is corrected to read as set 

forth above. 

[FR Doc. C1–2010–31877 Filed 12–29–10; 8:45 am] 

BILLING CODE 1505–01–P 

DEPARTMENT OF COMMERCE 

International Trade Administration 

Application(s) for Duty-Free Entry of 

Scientific Instruments 

Pursuant to Section 6(c) of the 

Educational, Scientific and Cultural 

Materials Importation Act of 1966 (Pub. 

L. 89–651, as amended by Pub. L. 106– 

36; 80 Stat. 897; 15 CFR part 301), we 

invite comments on the question of 

whether instruments of equivalent 

scientific value, for the purposes for 

which the instruments shown below are 

intended to be used, are being 

manufactured in the United States. 

Comments must comply with 15 CFR 

301.5(a)(3) and (4) of the regulations and 

be postmarked on or before January 19, 

2011. Address written comments to 

Statutory Import Programs Staff, Room 

3720, U.S. Department of Commerce, 

Washington, DC 20230. Applications 

may be examined between 8:30 a.m. and 

5 p.m.. at the U.S. Department of 

Commerce in Room 3720. 

Docket Number: 10–067. Applicant: 

University of Chicago, Argonne LLC, 

9700 South Cass Ave., Lemont, IL 

60439. Instrument: Pilatus 100K Pixel 

Detector System. Manufacturer: Dectris 

Ltd., Switzerland. Intended Use: The 

instrument will be used to study SmallAngle X-ray Scattering (SAXS) for 

chemical, biological, and materials 

science, time resolved diffraction, and 

x-ray surface diffraction for magnetic 

materials. The instrument is the first 

and only commercially available pixel 

array detector for x-ray applications. 

The instrument’s unique capabilities are 

a high detection efficiency (no readout 

noise and direct detection scheme), high 

dynamic range (20-bits), and fast 

readout speeds. Justification for DutyFree Entry: There are no instruments of 

the same general category being 

manufactured in the United States. 

Application accepted by Commissioner 

of Customs: December 6, 2010. 

Docket Number: 10–068. Applicant: 

University of Chicago, Argonne LLC, 

9700 South Cass Ave., Lemont, IL 

60439. Instrument: Pilatus 300K Pixel 

Detector System. Manufacturer: Dectris 

Ltd., Switzerland. Intended Use: The 

instrument will be used for wide angle 

SAXS, involving biological systems 

(proteins, RNA, DNA), catalysis 

reactions, and soft-condensed matter 

physics (e.g., ordering of polymers and 

colloidal suspensions). The instrument’s 

unique capabilities are a high detection 

efficiency (no readout noise and direct 

detection scheme), high dynamic range 

(20-bits), and fast readout speeds. 

Justification for Duty-Free Entry: There 

are no instruments of the same general 

category being manufactured in the 

United States. Application accepted by 

Commissioner of Customs: December 6, 

2010. 

Docket Number: 10–069. Applicant: 

University of Minnesota School of 

Dentistry, 6–150 MoosT, 515 Delaware 

St., S E, Minneapolis, MN 55455. 

Instrument: Dental Imaging System: 

Cross-Polarization Swept-Source 

Optical Coherence Tomography with a 

MEMS Handpiece. Manufacturer: 

Santec Corporation, Japan. Intended 

Use: The main use for the instrument is 

to study the oral biofilm of dental decay 

in children. This custom made imaging 

system will image under resin 

composite dental fillings. The three 

crucial aspects of the instrument are 

size (the hand piece is 16 X 15 X 80 

mm), speed (can operate at 30 kHz 

swept source speed), and image contrast 

(able to suppress the parallel 

polarization by 30 dB). Justification for 

Duty-Free Entry: There are no 

instruments of the same general 

category being manufactured in the 

United States. Application accepted by 

Commissioner of Customs: December 8, 

2010. 

Dated: December 22, 2010. 

Gregory Campbell, 

Director, IA Subsidies Enforcement Office. 

[FR Doc. 2010–32934 Filed 12–29–10; 8:45 am] 

BILLING CODE 3510–DS–P 

DEPARTMENT OF COMMERCE 

International Trade Administration 

Vanderbilt University, et al.; Notice of 

Consolidated Decision on Applications 

for Duty-Free Entry of Electron 

Microscopes 

This is a decision consolidated 

pursuant to Section 6(c) of the 

Educational, Scientific, and Cultural 

Materials Importation Act of 1966 (Pub. 

L. 89–651, as amended by Pub. L. 106– 

36; 80 Stat. 897; 15 CFR part 301). 

Related records can be viewed between 

8:30 a.m. and 5 p.m. in Room 3720, U.S. 

Department of Commerce, 14th and 

Constitution Avenue, NW., Washington, 

DC. 

Docket Number: 10–065. Applicant: 

Vanderbilt University, Nashville, TN 

37235. Instrument: Electron Microscope. 

Manufacturer: FEI Company, Czech 

Republic. Intended Use: See notice at 75 

FR 73034, November 29, 2010. 

Docket Number: 10–066. Applicant: 

Vanderbilt University, Nashville, TN 

37235. Instrument: Electron Microscope. 

Manufacturer: JEOL Limited, Japan. 

Intended Use: See notice at 75 FR 

73034, November 29, 2010. 

Comments: None received. Decision: 

Approved. No instrument of equivalent 

scientific value to the foreign 

instrument, for such purposes as these 

instruments are intended to be used, 

was being manufactured in the United 

States at the time the instruments were 

ordered. Reasons: Each foreign 

instrument is an electron microscope 

and is intended for research or scientific 

educational uses requiring an electron 

microscope. We know of no electron 

microscope, or any other instrument 

suited to these purposes, which was 

being manufactured in the United States 

at the time of order of each instrument. 


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