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1 1 12^^ United States Department of Commerce

I XI 1^31 National Institute of Standards and Technology

NIST Technical Note 1289

The NIST X-Ray Photoelectron Spectroscopy (XPS)

Database

Charles D. Wagner

NIST Technical Note 1289

The NIST X-Ray Photoelectron Spectroscopy (XPS)

Database

Charles D. Wagner

Surfex Company

29 Starview Drive Oakland, CA 94618

October 1991

.<i^ WW %

X T7 , <"

c

U.S. Department of Commerce

Robert A. Mosbacher, Secretary

National Institute of Standards and Technology

John W. Lyons, Director
National Institute of Standards U.S. Governnnent Printing Office For sale by the Superintendent

and Technology Washington: 1991 of Documents

Technical Note 1289 U.S. Government Printing Office

Natl. Inst. Stand. Technol. Washington, DC 20402

Tech. Note 1289

69 pages (Oct. 1991)

CODEN: NTNOEF
The NIST X-Ray Photoelectron Spectroscopy (XPS) Database

Charles D. Wagner

Surfex Company, 29 Starview Drive, Oakland, CA 94618

The technique known as XPS (X-Ray Photoelectron Spectroscopy) involves x-ray

irradiation of surface samples under high vacuum. Electrons escaping from the

samples are sorted and arranged to form a spectrum. A compilation of data for binding energy and kinetic energy of sample electrons from all elements has been

collected. Depending on the nature of the chemical bond, the chemical shift can be

as much as 10 eV. Over the past 6 years the author has indexed articles related to

this subject area. The data bank contains a total of 13,200 records, from a total of

800 papers.

Key words: Auger electron; Auger parameter; binding energy; chemical shift; core

level; doublet separation; photoelectron; XPS; X-Ray generation.

Contents

I. Introduction

II. Structure of the NIST X-Ray Photoelectron Spectroscopy (XPS) Database

1. Atomic number

2. Elemental symbol

3. Spectral line

4. Compound 2

5. Empirical formula 3

6. Physical state 3

7. Energy 4

8. Quality of the datum 5

9. Method of compensation for steady state charge 5

10. Instrument calibration 5

11. Compound type 6

12. Reference 6

13. Registry number 6

III. Elemental Data Summary 6 IV. Complete XPS Data 6 V. Acknowledgement 7

VI. Reference 7

Appendix A. Long References 34

Appendix B. References 37

Appendbc C. Figures 62

III

THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

I. Introduction

The technique of XPS was pioneered by Siegbahn and co-workers. In 1954 Siegbahn's group developed a high resolution electron spectrometer and in 1958 his group discovered that chemical shifts between copper

and its oxides could readily be resolved(SNS58). Since that time there has been great interest in chemical

surface analysis, encouraged by a written monograph by the Siegbahn's group (SNFN67) stating the principles of the technique. The technique is essentially nondestructive, sensitive to all elements except hydrogen

and helium, and samples a shallow surface region a few nanometers thick. It is restricted to low vapor

pressure compounds and can even be used to study organic materials nondestructively.

By 1973 the technique, widely known as Electron Spectroscopy for Chemical Analysis (ESCA), became

widely used through the development of high-quality commercial instruments. Since that time work in the

field has grown explosively. For example, by the end of 1985 over 780 papers had been written which

reported measurements of photoelectron and Auger line energies.

Because of the sheer volume of this work, the number of compounds studied, and the variability of the

quality of the data, it was clear that a critical compilation of available data was needed. In 1982, the author

began work under the sponsorship of the then National Bureau of Standards on a data base that was to include all data on inorganic and organic compounds from refereed journals. These data were eventually to be made available for computerized retrieval. This paper describes the structure of the resulting data bank, known as the NIST X-Ray Photoelectron

Spectroscopy (XPS) Database, and the nature of the data compiled for each compound or element. At the

time this paper was drafted, the author intended to include a listing of the data ordered by element through

1985 — about 13,200 records in all. However, the volume of these data was too large to make this practical.

Even this compilation is not entirely complete; some references include a large number of similar compounds, and, in the interest of brevity, only representative ones were selected. Because of its size, a printed

copy of the data base will be made available to interested parties upon request to Standard Reference Data,

National Institute of Standards and Technology, A323 Physics Bldg., Gaithersburg, MD 20899.

il. Structure of the NIST X-Ray Photoelectron Spectroscopy (XPS) Database

The data are organized into 13 fields.

1. Atomic number

This needs no elaboration.

2. Elemental symbol

The elements are presented in order of atomic number.

3. Spectral line Included are not only photoelectron and Auger lines, but also various useful line energy differ- ences. The following describes the different designations shown:

Photoelectron lines — Self-explanatory. In Figure 1 is shown a photoelectron line at 0-1070

binding energy in the reverse direction.

Doublet separation in photoelectron lines — This is indicated by Figure 2, simply by a A followed

by the line, e.g., A2p, A3p, A3d, A4p, A4d, A4f. Included also is the multiplet splitting of 3s, as in A3s.

Auger lines — The common Auger lines shown will be KL23L23('D), L3M45M45('G), M4N45N45,

M5N67N67, and sometimes, N6O45O45. This in the case of KL23L23 is exemplified by Figure 1, on the

kinetic energy direction. Valence type Auger lines, sometimes designated CVV, with final vacancies in valence levels, will ordinarily not be included; if they are, the notation will have V standing for
CHARLES D. WAGNER

the final vacancy, as in KW. Other Auger lines will ordinarily be cited only as energy difference

values from the above principal lines of each series (see below).

Separation from the sharpest Auger line — This category (Fig. 4) will be used for all Auger line energies other than KW or KL23L23('D), LW or L3M45M45('G), M4N45N45, M5N67N67, and

N6O45O45. The kinetic energy of the minor line cited will be subtracted from the standard line in its series, and the energy value will have a

" + " or " — ." Examples of the line designations are:

KL23L23CS)

L3M23M45CP)

M45N,N45

M4N67N67

Auger parameter — In the modified form, used here in Figure 1, is the kinetic energy of the sharpest

Auger line (one of those above) plus the binding energy of the most intense photoelectron line.

a3d5,M4N45N45

If the Auger line and the photoelectron line are supplied but not the Auger parameter, the Auger

parameter was derived by the reviewer from the data. The connotation (AP derived) is indicated in the column (see Sec. 9 — Method of compensation for steady state charge). With charge references of

photoelectron and Auger lines of doubtful value, both are omitted but the Auger parameter is retained.

Chemical shift from the elemental form — This is shown in Figure 3 when publications present both

peaks in the same spectrum, or when the elemental peak is not in the same spectrum but in the same

article. The absolute scale is not necessary because the chemical shifts are based on zero. Also the

alloys constitute a special case because the chemical shifts are so minimal (a fraction of a volt in most cases). Lines cited will be strong photoelectron lines, the standard Auger lines, and Auger

parameters, and there will be a

" + " or " — " on the chemical shift energy.

72p3

7L3M45M45('G)

7a2p3,L3M45M45('G)

4. Compound

Ordinarily the simple chemical formula is used, but with complex molecules the common name

can be substituted. Abbreviations commonly used in Chemical Abstracts will be used for naming the

compounds.

Data are supplied for bulk condensed states believed to be pure. Gas phase data are not included. In relatively rare instances, implanted atoms or well-defined monolayers will be included, with the

requirement that evidence be supplied that all of the atoms have the same environment.

If not all of the published line energy data for a compound are included in this tabulation, the

compound name will be followed by a

" -t- ."

If a compound has atoms of an element in more than one chemical state, the position of an

asterisk in the structural formula will indicate the atom for which data are presented. For the special case of carbon, it is usually assumed in this data set that aliphatic or aromatic carbon bound only to carbon and hydrogen has the binding energy 284.8 eV, and so these are not usually included in the

data.
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

If space does not permit, an abbreviation will contain an asterisk which will refer to an asterisk

with a more complete explanation such as:

With abbreviation More complete explanation

FeCb 2DMSO* *DMSO = di(Me)sulfoxide

If a footnote is appropriate such as an alternative common name, it will be written out and

indicated by an asterisk.

CeHe* benzene

(COONa)2* Na oxalate

(CH2)6N4* hexamethylenetetramine

Some compounds which are not obviously ionic are noted by (ionic cmpd) following the formula

or in several cases by a plus or minus sign ending the expression. Ionic compounds such as ammonium or phosphonium are not specially indicated because they are expected to be obvious. Some

abbreviations are the following:

M ox = thin metal oxide layers formed by passive oxidation, e.g., Al ox MYx = non-stoichiometric binary compound (rare), such as SiN

poly(-XXXX-) = polymer with repeat group (-XXXX-)

poly(RCH = CHX) = vinyl polymer

p-XXXX = para orientation on benzene ring

Am = the element americium, or the amyl group in an organic compound

acac = acetylacetonate

bzac or bzbz = benzoyl substitution for acetyl in acac

5. Empirical formula

In the case of organic compounds, the compound name is so complicated that it can be written in a multitude of ways, so that the empirical formula is the simple way out and is used.

6. Physical state When supplied in the article, some information about the physical state of the compound or element, or its method of preparation is conveyed by a code of one to three digits, as follows: A annealed

Ads adsorbed

Am amorphous

Arc arc method

Br2 Br2-ethanol

C cooled

CE chemically etched

CI cleaved crystal

Co co-condensed with a charge reference material

Cr crystal

Cru crushed

CVD chemical vapor deposition

EO electrolytic oxidation

ER electrolytic reduction

Ex exchangable

H heated

H2 hydrogen pressure
CHARLES D. WAGNER

H&C heated and cooled

Imp implanted

Ind induction heater

IR reaction by bombarding ions

L liquid

MBE molecular beam epitaxy

Ml multilayer

02 oxygen pressure

Oxi oxidizing atmosphere

Pc polycrystalline

PO passive oxide

Pwd powder (when a special point is made in the article)

R reacted

RF reacted film Red reducing atmosphere

Sc scraped

ScH scraped and heated

SD sputter deposited

Sp sputtered

Sp* this is an artifact made because there is no way of differentiation from Al K and Mg

K. All the primary keys are identical. Therefore the Phys. St. was used as Sp*.

SpA sputtered in argon

SpH sputtered and heated

TF thin film TL thin layer

TO thick oxide

VC vacuum cleaved

VD vapor deposited

VDH vapor deposited and heated

7. Energy

All energies are referred to the Fermi level. Ordinarily, values are shown to tenths of an eV, with some quoted to hundredths of an eV. Values are binding energies for photoelectrons and kinetic

energies for Auger electrons. The data have been standardized for a voltage scale that assumes with

Fermi level referencing that Au4f7 = 84.0, Ag3d5 = 368.2, Cu2p3 = 932.6, and Cls for hydrocarbon or hydrocarbon groups equals 284.8 eV (cf below under instrument calibration and charge referencing).

Data will not ordinarily be included unless correspondence with at least one point on this voltage

scale can be determined, and corrections made accordingly. Energy data corrected for this are

indicated by the designation "c" under the quality column.

Ordinarily there are no adequate data furnished to be assured of an energy scale of correct magnitude. When data are furnished for two widely-spaced photoelectron lines of an element corre- sponding to initial and final states of accurately determined x-ray transitions, the accuracy of the

energy scale magnitude can be checked, and data corrected when necessary. A similar operation can be conducted if calibration lines for Cu2p3 plus either Au4f7 or Ag3d5 are furnished. Data corrected

in this way for energy scale magnitude are designated by "a" in the quality column. Data from a few

references performed carefully for energy scale calibration purposes have not been changed, and are designated by "A" (see Sec. 8).

All line designations beginning with A, or 7, are difference values, and the energy values should be

plus or minus except for A applied to spin doublet separations or multiplet splitting (cf "Line"

above). Auger parameter values (line designations beginning with a) are inherently difference values

but are always positive.
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

8. Quality of the datum

The uses of "c" and "a" have already been described in the paragraphs above. When the line energy is within 300 eV of a reference point on the energy scale, such as Au4f7 when a conductive

material is examined, or Cls for adventitious hydrocarbon when charge referencing is done on an

insulator, a "G" is included, indicating a reasonable degree of reliability. A few studies have been

done very carefully and data from them are indicated by the letter "A", representing calibration

grade.

9. Method of compensation for steady state charge

Data on insulators are not included unless a technique for charge referencing is used that is believed to be valid. Some abbreviations are the following:

a. "Cond" indicates the material is sufficiently conducting, either because of its nature, or because

it is sufficiently thin not to require charge correction.

b. "Au" indicates the gold vapor deposition method, with Au4f7 assumed to be 84.0.

c. "AC" indicates use of the Cls line of adventitious hydrocarbon, assumed to be 284.8 eV.

d. "IC" indicates use of an internal hydrocarbon group of the compound, with the same assumed

energy.

e. "CC" indicates that a hydrocarbon was co-condensed with the vapor-deposited specimen and

used as the charge reference, with value 284.8.

If use of other charge referencing values in a paper requires changes in the energy data for this

set, this is indicated by the letter "c" in the Quality column.

Occasionally all energy values are referenced to a single element present in all the materials.

While this does not presume to give absolute line energies, it can furnish useful data, and this method is indicated in the Charge Reference column by a phrase such as "Fls = 684.6". A charge

reference is not needed for difference values, such as those beginning with A, 7 or a.

10. Instrument calibration The symbol FL means the instrument was calibrated to set zero binding energy at the Fermi edge

of a metal with high density of states at the conduction band. The symbol ON indicates the scale was

set at zero kinetic energy at the onset of electron emission. The symbol DVM indicates that voltages on the energy scale were calibrated directly with the aid of an accurate digital voltmeter.

In most studies, however, natural strong lines of conductors were used to establish the scale. For

this data set it is assumed that gold, silver, and copper as calibrants have their most intense spectral

lines at the following binding energies: Au4f7 = 84.0, AgSds = 368.2, and Cu2p3 = 932.6 eV. If these

lines were used in the instrument calibration, the symbols Au, Ag, or Cu indicate it, and if the values

used in the article were not the above, energy values for conducting species were corrected to correspond (see Energy and Quality paragraphs).

Determinations of line energies of elemental gold, silver, and copper with none of them cited as an energy scale reference are printed without change, but companion data from the same article on

other materials may be corrected for deviation of these standards from the values adopted here.

If data are furnished from which the magnitude of the voltage scale can be checked (such as widely separated calibration lines, or lines for elements that represent initial and final states of x-ray

transitions), these difference values are included. If the values are not those adopted for the x-ray

transitions or for widely separated calibration lines, a correction of the voltage scale magnitude may

be needed. When this has been done, the new and correct difference value is shown.
CHARLES D. WAGNER

energy values are corrected, and those corrected are indicated by an "a" symbol in the Quality

column. It should be understood that elemental states are used for instrument calibration unless

otherwise indicated,

11. Compound type

This has been used, not entirely consistently, to classify the compounds.

12. Reference

With multiple authors the first letter of each author's last name is used:

xxxx

XXX

In the case of two authors, the first two letters are used, capital and lower case: XxXx

In the case of one author, capital and three lower case letters are used:

Xxxx

This is followed by two digits, representing the last two digits of the year of publication. This may

be followed by a small letter, to distinguish between two otherwise identical reference notations.

In many cases the reference may end with a plus sign. This indicates that the reference includes a

large number of similar compounds, and, in the interest of brevity, only representative ones were

selected. The reader is encouraged to look for the simpler of a class of compounds, and if the

reference for it contains a plus sign, to consult the reference to obtain data on similar materials. A

complete list of references is given in Appendices A and B. Appendbc A contains the so-called "long

references" which have been separated out because of their length. Appendix B continas the majority of the references.

13. Registry number

Space is provided to enter the Chemical Abstracts Service Registry Number if it is needed in the

future.

ill. Elemental Data Summary

Below (Table 2) is a summary table of the most reliable elemental photoelectron energy values through

1985. These records are about ten percent of the total bank of elemental XPS data.

iV. Complete XPS Data

The NIST X-Ray Photoelectron Spectroscopy (XPS) Database is available from the NIST Standard

Reference Data Program, National Institute of Standards and Technology, A323 Physics Bldg., Gaithersburg, MD 20899, (301) 975-2208, Joan Sauerwein. The database is complete for XPS data through 1985. It

is lengthy and is not printed here, but will be sent to users on request. As an illustration, a subset for Tin

(Sn) is duplicated in Table 3 and Table 4. Also a division of the records into organic and inorganic is shown.

The criterion is based as a first approximation on the empirical formula for hydrogen content for organic

compounds.

Also a different type of subset is shown in Table 5. In this Table are shown 800 chemical states of 84

elements, witl: the main photoelectron and Auger lines in detail.

6
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

The records for the data bank include six types of spectral lines listed in Table 1 below.

Table 1. Distribution of Spectral lines

Type of Line Records

Photoelectron lines 9810 Doublet separation 950 Auger lines 784

Separation from the sharpest Auger lines 168 Auger parameter 910 Chemical shifts 578

V. Acknowledgement

This work was supported by the Department of Energy and the National Science Foundation through the

Program on Critical Evaluation of Physical and Chemical Data through the Standard Refernce Data Pro- gram of the National Institute of Standards and Technology.

VI. Reference

An additional discussion of the NIST X-Ray Photoelectron Spectroscopy (XPS) Database is given below.

C. J. Powell, "Formal Databases for Surface Analysis: The current Situation and Future Trends" in Quantitative Surface Analysis (London, Nov. 13-16, 1990).
CHARLES D. WAGNER

Table 2. The best values of elemental photoelectric energies as of 1985

Is

3 Li 54.8 cy KLMP 73

4 Be 111.8 G WRDM 79

5 B (186.5)>' G SMS 80

6 C

Na

284.45

1071.8

G

G

WVB

BaSt

80

75

2p

11 30.8 G BaSt 75

30.52 G Citr 73

12 Mg 1303.2 G Fugg 77 49.6

49.6 G

G

Fugg VaTr

77

79a

13 Al 72.85 72.92 G

G

Tayl

WPHK

8282

14 Si (99.44) G WPHK 82

15 P (130.00) G NSDU 75

16 S 164.1 164.15 164.25

G

G

G

Brio WRDM

RiVe

80

79

83

2P3

18 Ar (241.8) G KiWi 75

19 K 294.7 G PeKa 77 20 Ca 345.9 G VaVe 80 3p

21 So (398.3) 453.89 G MFA 85 22 Ti A^ LANM 81 32.5 A^ LANM 81 453.73 A ALMP 82

23 V 512.14 A LANM 81 37.2 A LANM 81 24 Cr 574.26 A LANM 81 42.3 A LANM 81 25 Mn 638.78 A LANM 81 47.2 A LANM 81

Fe 706.74 A LANM 81

3p3

26 52.5 A LANM 81 706.82 A Asam 86

27 Co 778.32 A LANM 81 58.9 A LANM 81 28 Ni 852.68 A LANM 81 66.1 A LANM 81 852.8 A PEJ 82 66.5 A PEJ 82

852.73 A ALMP 82

29 Cu 932.57 A LANM 81 75.13 A LANM 81

932.7 A PEJ 82 75.20 A PEJ 82

932.67 A AnSe 84

932.55 A ALMP 82

932.62 A BiSw 80 3d

Zn

932.70

1021.82 A

A

BiSw

LANM

80

30 81 10.00 A LANM 81 1021.70 A Evan 85 9.78 A Evan 85

1021.96 A LKMP 73 10.18 A LKMP 73

31 Ga 1116.67 A Evan 85 18.69 A Evan 85 32 Ge 1217.28 A Evan 85 29.45 A Evan 85

1217.38 A Evan 85 29.65 A Evan 85

1217.2 A McWe 76 29.3 29.0 A

A

McWe

SFS77

76

33 As 41.5 G BWWI 76

3ds

34 Se 55.1 A BWI 80

37 Rb 112.0 G EbSi 79

38 Sr 134.4 G VaVe 80

39 Y 155.8 A NyMa 80 40 Zr 178.79 A NyMa 80

41 Nb 202.26 A NyMa 80

42 Mo 227.94 A NyMa 80

44 Ru 280.02 A NyMa 80 45 Rh 307.18 A NyMa 80 46 Pd 335.08 A NyMa 80

335.18 A VaTr 79

335.20 A Asam 86

335.2 A JHBK 73

27.1 30.8

35.5

43.4

47.3

4P3 A NyMa 80 A NyMa 80 A NyMa 80 A

A

NyMa

NyMa

8080
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

Table 2. The best values of elemental photoelectric energies as of 1985 — Continued

3ds

335.20 A BiSw 80

335.47 A BiSw 80 47 Ag 368.2 368.22

368.23 368.28 368.10

A

A

A

A

A

JHBK

NyMa

Asam

AnSe

BiSw

7380

86

84

80

368.16 A BiSw 80 4d5

368.21 405.15 A

A

BiSw

NyMa

80

48 Cd 81 10.2 A PUL 73

10.47 A PKLS 72

49 In 443.86 A NyMa 81 16.74 A PKLS 72

50 Sn 484.8 A VaTr 79 24.04 A VaTr 79

484.92 A NyMa 80 23.95 23.68

24.1

A

A

A

NyMa

PKLS

SFS

80

7277

51 Sb 528.2 A VaTr 79 32.3 32.07

32.1 32.14

A

A

A

A

VaTr NyMa

SFS PKLS

79

80

77

72 52 Te 572.98 A NyMa 80 40.44 A NyMa 80

573.0 A SFS 77 40.5 40.31 A

A

SFS PKLS

7772

53 I (619.9)

(619.9) DMKK

Sher

84

76

55 Cs 726.0 G KDR 77 77.3 A SLCO 83 56 Ba 780.6 G KoGr 85 90.2

90.4 GG

KoGr

VaVe

8580

57 La (835.9)

(835.9) SOS

ScSc

82

82

103.7 G KEML 74

58 Ce (883.2)

(883.9) (883.9)

PKHL

SOS

ScOs

80

82

82

(111.2) NIS 72

59 Pr (932.0) FuOs 84

62 Sm (1081.2) DKMB 76

128.4 141.7 G

G

NNBF

TeLe

68

79

4d<

70 Yb (181.4) (181.4)

(182.7)

(183.0)

G

G

G

G

HHL

KEML

LPWF

PLNW

70

74

7577

71 Lu (196.1) G KEML 74

(196.3) G LPWF 75 4f7 (196.6) 211.5 G PLNW 77 72 Hf A NBM 80 14.23 A NBM 80

73 Ta 226.4 A NBM 80 21.61 21.64 A

A

NBM

VHE

80

82 74 W 243.5 A NBM 80 31.32 A NBM 80

75 Re 260.5 A BNMN 79 40.46 A BNMN 79 76 Os 278.5 A BNMN 79 50.7 A BNMN 79

77 Ir 296.3 A NMB 80 60.75 A NMB 80

78 Pt 314.6 A NMB 80 71.07 A NMB 80

314.6 A KNNH 68 71.0 71.07 A

A

JHBK

VaTr

7379
CHARLES D. WAGNER

Table 2. The best values of elemental photoelectric energies as of 1985 — Continued

4d5 4f7

79 Au 334.7 A VaTr 79 83.97 A VaTr 79

335.2 A NBM80 84.00 A NBM 80

335.1 A PEJ 82 84.0 84.00

84.07

84.1 84.15 83.86

83.98

A

A

A

A

A

A

A

MKLP

AnSe

Asam

PEJ ALMP

BiSw

BiSw

738486

82

82

80

80 80 Hg 359.3 G SMBM 76 99.9 G SMBM 76

81 Tl 385.0 G MBN 80 117.73 G MBN 80

82 Pb 412.0 A NBM 80 136.78 A NBM 80

412.0 A SFS 77 136.8 A SFS 77

83 Bi 440.1 A NBM 80 156.85 A NBM 80

440.3 A VaTr 79 156.88 A VaTr 79

440.4 A SFS 77 156.9 157.0 A

A

SFS LKMP

77

73

90 Th (675.2) FBWF 74 333.1 G ScU 81

(675.2) ScLa 81 333.25 G WRDM 79

92 U (736.0) FBWF 74 376.9 G VRPC 74

(736.4) ScLa 81 377.1 G ACCT 74

(736.8) ACCT 74 377.1 377.4

377.4

G

G

G

Chad

ScLa WRDM

73

8179

I

"When the data are within 300 eV of a point of reference, they are indicated by a "G". 'When the data are enclosed by a parenthesis, it is indicated that the data are not within bounds of 300 eV, or if they are within "G", they are still so scattered that several competing data must be supplied. ^A few data have been done very carefully, and all of these data are indicated by the letter "A", representing calibration grade.

10
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

Table 3. Inorganic compounds for which Sn was being observed by photoelectron or Auger spectroscopy.

Spectral Compound Physical Energy Quality Charge Calibration Reference

Line State (eV) Reference Method

Binding Energy

3s Sn Sc 885.3 A Au Au NyMa 80

3p3 K2SnF6 717.2 c AC MoVa 73 3p3 Sn Sc 714.6 A Cond Au4f7 = 83.97 Pd3d5 = 335.18 VaTr 79 3p3 Sn Sc 714.7 A Au Au NyMa 80 3p3 Sn Sc 714.7 A Cond Au,Nals-2p= 1041.1 SFS 77 3p3 SnF2 716.3 c AC MoVa 73

3p3 SnO 716.2 c AC MoVa 73 3p3 Sn02 716 c AC MoVa 73

3d5 (NH4)2SnC16 486.7 c Au GZF 73 +

3d5 Ag95Sn5 485.6 G Cond Au,Ag,Cu HSBS 81 3d5 Ba(SnCI3)2 486.8 Gc AC FL WVV 79 +

3d5 BaSnCi4 486.8 Gc AC PL WW 79 +

3d5 Cd2Sn04 486 Gc AC Au GHMH 83

3d5 Cd996Sn4 485.3 G Cond Au,Ag,Cu HSBS 81 3d5 CdSn03 486.1 Gc AC Au GHMH 83 3d5 Co20Sn80 Sp 484.7 Cond Au ThSh 78 3d5 K2SnF6 487.6 Gc AC MoVa 73 3d5 KSnF3 486.7 c Au GZF 73 +

3d5 Na2Sn03 486.2 Gc AC MoVa 73 3d5 Na2Sn03 486.7 Gc AC Au.Cu Wagn 75 3d5 Na2Sn03 486.8 Gc AC Shut 80 3d5 Na2Sn03 487.2 Gc AC ADPS 77 3d5 NaSnF3 487.4 Gc AC Au.Cu Wagn 75

3d5 Pb98Sn2 486.4 G Cond Au,Ag,Cu HSBS 81 3d5 Sb95Sn5 485.2 G Cond Au,Ag,Cu HSBS 81 3d5 Sn 484.4 Cond FL WW 79 +

3d5 Sn 484.7 Gc AC FaGo 77 3d5 Sn 484.8 Cond ON PWA 79

3d5 Sn 484.8 Gc AC Shut 80 3d5 Sn 484.87 G Cond Vacuum Nels = 870.27 (Ne2s = 48.47) VeCa 85 3d5 Sn 484.9 Cond Au TLR 78 3d5 Sn 484.9 G AC LAK 77 3d5 Sn 485.2 Gc AC OCH 79

3d5 Sn Sc 484.8 A Cond Au4f7 = 83.97 Pd3d5 =335.18 VaTr 79 3d5 Sn Sc 484.92 A Au Au NyMa 80 3d5 Sn Sc 485 Gc Cond Au.Cu Wagn 75 3d5 Sn Sc 485.1 A Cond Au,Nals-2p= 1041.1 SFS 77 3d5 Sn Sp 484.3 c Cond Au ADPS 77

3d5 Sn Sp 484.7 Cond Au ThSh 78 3d5 Sn Sp 484.85 Gc Cond Au.Cu WRDM 79 3d5 Sn SpA 485 Cond SHR 82 3d5 Sn VD 484.8 Cond BVWW 80 3d5 Sn VD 484.87 G Cond Ag PWA 79

3d5 Sn.alpha 486.72 Au WaHu 74 3d5 Sn.alpha SpA 485 G Cond AuCu Hegd 82

3d5 Sn.beta 484.6 G Cond Au,Ag,Cu HSBS 81 3d5 Sn.beta 486.1 Au WaHu 74 3d5 Sn.beta SpA 484.6 G Cond AuCu Hegd 82

11
CHARLES D. WAGNER

Table 3. Inorganic compounds for which Sn was being observed by photoelectron or Auger spectroscopy — Continued

Spectral Compound Physical Energy Quality Charge

Line State (eV) Reference

Binding; Energy

3d5 SnBr2 486.9 c Au

3d5 SnCi2 486.5 c Au

3d5 SnC12 486.7 Gc AC

3d5 SnF2 487 Gc AC

3d5 SnF2 487.1 c Au

3d5 SnF2 487.4 Gc AC

3d5 SnF4 487.9 c Au

3d5 SnF4 488.2 Gc AC

3d5 SnMo6S8 486.2 Gc AC

3d5 SnO 485.6 Gc AC

3d5 SnO 486 Gc AC

3d5 SnO 486.6 c Au

3d5 SnO 486.9 Gc AC

3d5 SnO 487 Gc AC

3d5 SnO Sc 487 Gc AC

3d5 Sn02 486.1 Gc AC

3d5 Sn02 486.2 Gc AC

3d5 Sn02 486.5 Gc AC

3d5 Sn02 486.6 Gc AC

3d5 Sn02 486.6 Gc AC

3d5 Sn02 486.7 Gc AC

3d5 Sn02 486.7 Gc AC

3d5 Sn02 486.7 c Au

3d5 Sn02 486.8 Gc AC

3d5 Sn02 PO 486.6 G AC

3d5 Sn02 Sc 486.5 Gc AC

3d5 SnS 485.6 Gc AC

3d5 SnS 486.4 Gc AC

3d5 SnS CI 485.7 G Cond

3d5 SnS2 486.8 Gc AC

3d5 SnSe CI 485.7 G Cond

3d5 SnTe Sc 485.6 G Cond

4s Sn Sc 136.8 A Cond

4s Sn Sc 137.2 A Au

4p Sn Sc 85.2 A Cond

4d Sn 24.5 Cond

4d Sn SpA 24.2 Cond

4d5 Sn 23.68 G Cond

4d5 Sn Cr 23.68 A Cond

4d5 Sn Sc 23.95 A Au

4d5 Sn Sc 24.04 A Cond

4d5 Sn Sc 24.1 A Cond

4d5 Sn VD 23.68 Cond

4d5 SnS CI 24.8 G Cond

4d5 SnSe CI 24.7 G Cond

4dS SnTe Sc 24.5 G Cond

Calibration Method

Reference

GZF 73 + GZF 73 + FL WW

MoVa

GZF

Shut GZF

Shut MAS

Shut ADPS

GZF

79 +

7373 +

80

73 +

80

8580

77

73 + FL WW

MoVa

FaGo

Shut

79 +

7377

80 Au GHMH

ADPS

MoVa

8377

73 Au.Cu WRDM

NGDS

79

75 FL WW

GZF

79 +

73 + Au TLR

LAK

FaGo

78

77

77 Au.Cu Wagn

MoVa

75

73 Au, Nalsi-2p == 1041.1 SFS MoVa

77

73

Au, Nals;-2p == 1041.1 SFS 77 Au, Nals;-2p == 1041.1 SFS 77

Au4f7 = 83.97 Pd3d5 == 335.18 VaTr 79 Au NyMa 80

Au4f7 = 83.97 Pd3d5 == 335.18 VaTr 79 ON PWA

SHR

79

82 Vacuum Nels = 870.27 (Ne2s = 48.47) VeCa 85 AuFL PKLS 72 Au NyMa 80 Au4f7 = 83.97 Pd3d5 == 335.18 VaTr 79 Au, Nals-2p == 1041.1 SFS 77 Ag PWA 79 Au, Nals-2p = 1041.1 SFS 77 Au, Nals-2p = 1041.1 SFS 77 Au, Nals-2p == 1041.1 SFS 77

12
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

Table 3. Inorganic compounds for which Sn was being observed by photoelectron or Auger spectroscopy — Continued

Spectral Compound Physical Energy Quality Charge Calibration Reference

Line State (eV) Reference Method

Auger

M455 Na2Sn03 431.7 Gc AC Au.Cu Wagn 75 M455 NaSnF3 430.8 Gc AC Au.Cu Wagn 75 M455 Sn 437.27 G Cond Vacuum Nels = 870.27 (Ne2s == 48.47) VeCa 85 M455 Sn 437.5 AC LAK 77 M455 Sn So 437.4 Gc Cond Au.Cu Wagn 75 M455 Sn Sc 437.5 A Cond Au4f7 = 83.97 Pd3d5 = 335.18 VaTr 79 M455 Sn Sp 437.6 Gc Cond Au.Cu WRDM 79 M455 Sn VD 437.27 Cond Ag PWA 79 M455 Sn02 PO 432.6 AC LAK 77 M455 SnS 435.7 Gc AC Au.Cu Wagn 75 M555 Sn 428.85 G Cond Vacuum Nels = 870.27 (Ne2s == 48.47) VeCa 85 M555 Sn 428.9 Cond ON PWA 79 M555 Sn Sc 429 A Cond Au4f7=83.97 Pd3d5 = 335.18 VaTr 79

Auger Parameter

3d5-M4 Na2Sn03 918.4 G Au.Cu Wagn 75 3d5-M4 NaSnF3 918.2 G Au.Cu Wagn 75 3d5-M4 Sn 922.14 Vacuum Nels = 870.27 (Ne2s == 48.47) VeCa 85 3d5-M4 Sn 922.4 LAK 77 3d5-M4 Sn Sc 922.4 G Au.Cu Wagn 75 3d5-M4 Sn Sp 922.45 G Au.Cu WRDM 79 3d5-M4 Sn VD 922.14 Ag PWA 79 3d5-M4 Sn02 PO 919.2 LAK 77 3d5-M4 SnS 921.3 G Au.Cu Wagn 75 3d5-M5 Sn 913.7 ON PWA 79 3d5-M5 Sn 913.72 Vacuum Nels = 870.27 (Ne2s == 48.47) VeCa 85 4d5-M4 Sn 460.95 Vacuum Nels = 870.27 (Ne2s == 48.47) VeCa 85 4d5-M5 Sn 452.53 Vacuum Nels = 870.27 (Ne2s == 48.47) VeCa 85

Chemical Shift

3p3 AuSn Sc + 0.2 A Cond Au4f7 = 83.97 Pd3d5 = 335. 18 VaTr 79

3d5 Ag95Sn5 + 1 Cond Au,Ag,Cu HSBS 81 3d5 Ag95Sn5 SpA + 1 G Cond AuCu Hegd 82 3d5 AuSn + 0.4 Au FHPW 73 3d5 AuSn Sc + 0.3 A Cond Au4f7= 83.97 Pd3d5 = 335.18 VaTr 79 3d5 AuSn4 + 0.1 Au FHPW 73

3d5 Cd99.5Sn5 SpA + 0.7 G Cond AuCu Hegd 82 3d5 Cd996Sn4 + 0.7 Cond Au,Ag,Cu HSBS 81 3d5 CsSn RF + 0.0 BVWW 80 3d5 Cu95Sn5 SpA + 1 G Cond AuCu Hegd 82 3d5 In95Sn5 SpA + 0.6 G Cond AuCu Hegd 82

3d5 Pb95Sn5 SpA + 1.8 G Cond AuCu Hegd 82 3d5 Pb98Sn2 + 1.6 Cond Au,Ag,Cu HSBS 81 3d5 Sb95Sn5 + 0.6 Au.Ag.Cu HSBS 81 3d5 Sb95Sn5 SpA + 0.6 G Cond AuCu Hegd 82

3d5 Sn ox RF + 1.5 WaBi 73

3d5 Sn5Cu95 + 1 Au HeSi 83

4d Sn ox RF + 1.2 WaBi 73

13
CHARLES D. WAGNER

Table 3. Inorganic compounds for which Sn was being observed by photoelectron or Auger spectroscopy — Continued

Spectral Compound Physical Energy Quality Charge

Line State (eV) Reference

Auger Parameter

d5 AuSn Sc + 0.3 A Cond

M455 AuSn Sc -0.3 A Cond

M455 Sn ox PO -3.4 M455 Sn ox RF -3.9 M455 Sn ox RF -4.1 G

M555 AuSn Sc + 0.3 A Cond

3d5-M4 AuSn Sc + 0.0 A Cond (AP

3d5-M4 Sn ox RF -2.4

Doublel Separation

3p Sn Sc 41.9 3p Sn Sc 41.9 A

3p Sn Sc 41.9 A Cond

3d Sn 8.4 3d Sn 8.45 3d Sn Sc 8.3 3d Sn Sc 8.4 A Cond

3d Sn Sc 8.41 A

3d Sn Sp 8.5 3d Sn VD 8.45 3d SnMo6S8 8.5 3d SnO 8.5 3d Sn02 8.5

4d Sn 1.08 4d Sn Cr 1.08 4d Sn Sc 0.98 A Cond

4d Sn Sc 1.05 A

4d Sn VD 1.08

Calibration Method

Au4f7 = 83.97 Pd3d5 = 335.18

Reference

VaTr 79

Au4f7 = 83.97 Pd3d5 = 335.18 VaTr 79 SHR 82 WaBi 73 BBG 79

Au4f7 = 83.97 Pd3d5 = 335.18 VaTr 79 Au4f7 = 83.97 Pd3d5 = 335.18 VaTr 79 WaBi 73

Au,Nals-2p= 1041.1 SFS 77 Au NyMa 80 Au4f7 = 83.97 Pd3d5 = 335.18 VaTr 79 FaGo 77 Vacuum Nels = 870.27 (Ne2s == 48.47) VeCa 85 Au, Nals-2p= 1041.1 SFS 77 Au4f7 = 83.97 Pd3d5 = 335. 18 VaTr 79 Au NyMa 80 Au.Cu WRDM 79 Ag PWA 79 MAS 85 FaGo 77 FaGo 77 Vacuum Nels = 870.27 (Ne2s == 48.47) VeCa 85 AuFL PKLS 72 Au4f7 = 83.97 Pd3d5 = 335.18 VaTr 79 Au NyMa 80 Ag PWA 79

Separation from Strongest Auger Line M555 Sn VD -8.5 BBG 79

14
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

Table 4. Organic compounds for which Sn was being observed by photoelectron or Auger cpectroscopy.

Spectral Compound Physical Energy Quality Charge Calibration Reference

Line State (eV) Reference Method

Binding Energy

3p3 Ph4Sn 716 c IC MoVa 73

3d5 (Et4N)2SnBr6 487 Gc IC FL WW 79 +

3d5 (Et4N)3Pt(SnCI3)5 486.9 Gc IC Rigg 72 +

3d5 (Me4N)2 < Pt(SnC13)2C12 > 486.7 Gc IC AKSK 82 +

3d5 (Me4N)2<Pt(SnC13)5> 486.8 Gc IC AKSK 82 +

3d5 (Me4N)2SnC16 486.7 Gc IC AKSK 82 +

3d5 (Me4N)SnC13 485.3 Gc IC AKSK 82 +

3d5 (PhCH2)2SnC12 487.6 Gc IC MoVa 73 3d5 (PhCH2)3SnCi 486.9 Gc IC MoVa 73 3d5 AgSnC13(Ph3P)3 487 Gc IC GZF 73 +

3d5 Br4Sn(pyrazine) 487.4 Gc IC FMPB 81

3d5 Bu2SnO 485.6 Gc IC FL WW 79 +

3d5 Ci2Ph2Sn(pyrazine) 487.5 Gc IC FMPB 81 3d5 C13BuSn(pyrazine) 487.6 Gc IC FMPB 81 3d5 C13MeSn(pyrazine) 487.5 Gc IC FMPB 81 3d5 C130ctSn(pyrazine) 487.6 Gc IC FMPB 81

3d5 Ci3PhSn(pyra2ine) 487.9 Gc IC FMPB 81 3d5 C13SnCo(CO)3AsPh3 487.2 Gc IC WW 79 +

3d5

• C13SnMo(CO)3(C5H5) 487.1 Gc IC WW 79 +

3d5 C13SnMo(CO)3(C5H5) 487.3 Gc IC WWW 77 3d5 Ci3SnW(CO)3(C5 H5) 487 Gc IC WW 79 +

3d5 C13SnW(CO)3(C5H5) 487 Gc IC WWW 77 3d5 C14Sn(pyrazine) 487.8 Gc IC FMPB 81 3d5 C14Sn(pyrazine)2 488.1 Gc IC FMPB 81 3d5 Et2Sn(5-Ac-8-quinolinoI)2 487.4 Gc IC UBS 83 +

3d5 EtSnCI3(pyridine)2 487.2 Gc IC FL WW 79 +

3d5 I4Sn(pyrazine) 487.6 Gc IC FMPB 81 3d5 Me2CiSnMo(CO)3(C5H5) 486.3 Gc IC WWW 77 3d5 Me2ClSnW(CO)3(C5H5) 486 Gc IC WWW 77 3d5 Me2Sn(MeCOCHCOMe)2 VD 486.81 Cond Pt4f7 = 71.2 BALS 76 +

3d5 Me2Sn(8-quinolinoI)2 486.96 Gc IC UBS 83 +

3d5 Me2Sn(PhCOCHCOPh)2 VD 486.87 Cond Pt4f7 = 71.2 BALS 76 +

3d5 Me2SnCi2(DMSO)2 487 Gc IC WW 79 +

3d5 Me2SnF2 487.1 Gc IC FL WW 79 +

3d5 Me2SnI2(bipyridyl) 486.3 Gc IC WW 79 +

3d5 Me2SnS04 487 Gc IC FL WW 79 +

3d5 Me3SnF 486.7 Gc IC FL WW 79 +

3d5 Me3SnMo(CO)3(C5H5) 485.3 c Au GrMa 75 +

3d5 Me3SnW(CO)3(C5H5) 485.8 Gc IC WWW 77 3d5 Me4NSnCi3 486.1 Gc IC GZF 73 +

3d5 MeC12SnW(CO)3(C5H5) 486.3 Gc IC WWW 77

3d5 Ph2Sn(PhCOCHCOPh)2 VD 486.64 Cond Pt4f7 = 71.2 BALS 76 +

3d5 Ph3Sn(8-quinoiinol) 487 Gc IC UBS 83 +

3d5 Ph3Sn(PhCOCHCOPh) VD 486.55 Cond Pt4f7 = 71.2 BALS 76 +

3d5 Ph3SnBr 487.5 Gc IC HWW 74 3d5 Ph3SnCl 486.3 Gc IC FL WW 79 +

3d5 Ph3SnCI 487 Gc IC MoVa 73 3d5 Ph3SnCl 487.6 Gc IC HWW 74 3d5 Ph3SnF 486.2 Gc IC FL WW 79 +

3d5 Ph3SnF 487.3 Gc IC HWW 74 3d5 Ph3SnFc(CO)2(C5H5) 485.4 Gc IC WW 79 + 15
CHARLES D. WAGNER

Table 4. Organic compounds for which Sn was being observed by photoelectron or Auger spectroscopy — Continued

Spectral Compound Physical Energy Quality Charge Calibration Reference

Line State (eV) Reference Method

Binding Energy

3d5 Ph3SnGePh3 485.1 Gc IC FL WW 79 +

3d5 Ph3SnI 486.3 Gc IC PL WW 79 +

3d5 Ph3SnI 487.5 Gc IC HWW 74 3d5 Ph3SnMo(CO)3(C5H5) 486 Gc IC WWW 77 3d5 Ph3SnOH 485.6 Gc IC FL WW 79 +

3d5 Ph3SnOSnPh3 485.6 Gc IC FL WW 79 +

3d5 Ph3SnSSnPh3 485.3 Gc IC FL WW 79 +

3d5 Ph3SnW(CO)3(C5H5) 485.8 Gc IC WW 79 +

3d5 Ph3SnW(CO)3(C5H5) 486.1 Gc IC WWW 77 3d5 Ph4Sn 485.1 Gc IC FL WW 79 +

3d5 Ph4Sn 486.3 Gc IC MoVa 73 3d5 Ph4Sn 487.1 Gc IC HWW 74 3d5 Ph4Sn VD 485.85 Cond Pt4f7 = 71.2 HALS 76 +

3d5 PhCISn(PhCOCHCOPh)2 VD 487.18 Cond Pt4f7 = 71.2 BALS 76 +

3d5 PhSnC13(pyridine)2 487.2 Gc IC FL WW 79 +

3d5 Sn(5,7-C12-8-quinoIinol)2 487.18 Gc IC UBS 83 +

3d5 Sn(8-quinolinol)2 488.1 Gc IC UBS 83 +

3d5 SnC14(Me2SO)2 487.1 Gc IC GZF 73 +

3d5 SnC14(dimethylsulfone)2 486.9 Gc IC WW' 79 +

3d5 SnCI4(pyridine)2 487.3 Gc IC WW 79 +

4d Ph3SnBr 26.6 Gc IC HWW 74 4d Ph3SnCi 26.9 Gc IC HWW 74 4d Ph3SnF 26.4 Gc IC HWW 74 4d Ph3SnI 26.6 Gc IC HWW 74 4d Ph4Sn 26.5 Gc IC HWW 74

Doublet Separation

3d Ph4Sn VD 8.39 Pt4f7 = 71.2 BALS 76 +

16
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

Table 5. A subset of values of photoelectron binding energies and Auger kinetic energies for ail the elements.

Values in Chemical State Values in Error ( 0.5 eV)

Is

LITHIUM

LiLiO

LiOH

LiCl LiF Li2C03

BERYLLIUM

BeBeO

BeF2

NaBeF3

BORON

B

TiB2

BN

B203

H3B03

Na2B407

NaBF4

CARBON

C.graphite

Tie

C6H6

Na2C03

C02

CCI4 CF2CF2

NITROGEN

CrN

Si3N4

BN

NH3

NH4C1

NH4N03

NaN02

NaN03

OXYGEN

CdO

NiO

Ni(0H)2

CuO

Cu20

CoO

Co304

Mo03

A1203

KC103

KC104

poIy(CH2CHOH)

H20

Co(CO)6

3 54.8

55.6 54.9 3 56.1 3 1 55.7 2 55.2

3 111.8 4 113.7 2 1 115.3

115.3

2 1 186.5

187.5 4 190.5 4 193.1 2 193.0

191.8 2 194.9

5 284.5 3 281.5 3 284.9 2 289.4

291.9

292.4 2 1 292.6

396.8

3 1 397.7 4 1 398.1

3 1 398.8

4 1 401.7 4 2 401.9

5 2 403.8

5 2 407.3

4 529.2 10 529.5 9 531.2 9 1 529.6 7 1 530.4 7 530.2 6 530.2

11 2 530.62

17 4 531.0 3 531.87 3 532.92 3 532.6 3 533.1 5 1 533.9

Ref. (median)

KLMP 73 CSFG 79 CSFG 79 MVS 73 MVS 73 CSFG 79

WRDM 79 NFS 82 NKBP 73 NKBP 73

SMS 80 MECC 73 WRDM 79 SMS 80 SMS 80 SMS 80 RNS 73

SmBl 84 IKIM 73 CKAM 72 HHDD 81 GHHL 70 GHHL 70

Tayl 78

STAB 76 TLR 78 WRDM 79 LaLu 79 BTE 77 BCM 78 DML 84 DML 84

NFS 82 LoSt 84 Lost 84 MSSS 81 MSSS 81 NGDS 75 NGDS 75 BFCB 83 StHe 84 TCCW 85 TCCW 85 PRCV 77 WZR 80 KTWY 76 17
CHARLES D. WAGNER

Table 5. A subset of values of photoelectron binding energies and Auger kinetic energies for all the elements — Continued

Values in Chemical State Values in Error ( 0.5 eV)

Is

FLUORINE

CaF2 4 684.8 LiF 5 1 685.0 NaF 5 1 684.5 KF 4 683.9 MgF2 4 685.52 UF4 4 1 684.8 K2NbF7 2 685.2 Ni(OOCCF3)2 688.4 poly(CF2CF2) 3 1 690.0 C6F6 690.9 NF4BF4 694.2

Is KL23LM a NEON

Nc(implanted in Fe) 863.4 818.0 1681.4 Ne(implanted in diamond) 863.1 818.7 1681.8 Ne(implanted in Ag) 862.4 SODIUM

Na 4 1071.8 994.3 2066.1 Na3Sb 2064.8 Na20 1072.5 989.8 2062.3 NaN02 1071.6 989.8 2061.4 NaN03 1071.4 989.4 2060.8 Na3P04 3 1071.1 990.2 2061.3 NaP03 3 1071.6 989.4 2061.0 Na2S03 3 1 1071.4 990.2 2061.6 Na2S04 3 1 1071.2 989.8 2061.0 Na2Cr04 2 1071.2 990.9 2062.1 Na2Mo04 2 1 1070.9 991.0 2061.9 NaBi03 1071.3 990.9 2062.2 Nal 2 1071.6 991.2 2062.8 NaBr 3 1 1071.7 990.6 2062.3 NaCI 8 5 1071.6 990.3 2061.9 NaOOCH 1071.1 989.8 2060.9 NaOAc 2 1 1071.1 989.9 2061.0 natrolite(Na2A12Si3O10) 1072.4 988.5 2060.9 Na zeolite A (NaAlSi04) 2 1071.7 988.9 2060.6 Na2ZrF6 1071.5 988.7 2060.2 NaF 4 1 1071.2 988.6 2059.8 NaBF4 1072.7 987.1 2059.8 Na2SiF6 2 1071.7 987.7 2059.4

2p KLjjLu a Is MAGNESIUM

Mg 9 49.6 1185.6 1235.2 1303.2 Mg2Cu 49.5 1186.0 1235.5 1302.6 Mg3Bi 50.3 1184.9 1235.2 1303.6 MgO 50.4 1180.4 1230.8 1304.0 Mg(OH)2 49.5 1302.7 MgA1204 50.4 1304.0 MgF2 2 50.95 1178.15 1229.1 1305.0 Mg acetylacetonate 50.1 1180.5 1230.6 1304.0 Mg erucate 50.7 1180.2 1230.9 1304.4

Ref. (median)

WRDM 79 NBK 74 NBK 74 NBK 74 MuTh 80 Chad 73 NBK 74 WRDM 79 CFKM 73 CKAM 72 RNS 73

Wagn 75 Evan 80 CiHa 74

BaSt 75 BaGa 80 BaSt 75 Wagn 75 WGR 79

Swif 82

Swif 82 WGR 75 Wagn 75 WGR 79 WGR 79 WGR 79 Wagn 75 Wagn 75 Wagn 75 WGR 79 Wagn 75 WPHK 82 WPHK 82 Wagn 75 Wagn 75 Wagn 75 Wagn 75

Fugg 77 FWPF 75 FWPF 75 WRDM 79 HKNU 78 HNUW 78 Wagn 80 WGR 79 WGR 79

18
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

Table 5. A Subset of values of photoelectron binding energies and Auger kinetic energies for all the elements — Continued

ALUMINIUM

AlAIAs AIN

A1203,alpha

A1203,gamma

AI203,sapphire

AI(OH)3

CuA1204

natrolite

sillimanite molecular sieve type A

SILICON

SiMoSi2

PtSi SiC Si3N4

Ph4Si Si02

Si02 a-quartz Si02 Vycor

Si02 gel methylsilicone resin poly-dimethylsiiicone

pyrophyllite

spodumcne

albite natrolite hydroxysodalite molecular sieve type A

Na2SiF6

PHOSPHORUS

P (red) BP

CrP GaP

InP P205

Ph3P

Ph3PO

Ph3PS

NaP03

Na2HP04

Na3P04

SULFUR

SZnS

NiS

WS2

Na2S03

Na2S203 (central S) Na2S203 (peripheral S) CuS04

Na2S04

SF6

CS2

SO

Values in Chemical State Values in Error ( 0.5 eV)

2p KLuLm

1393.29

1391.2

1388.9 1388.24

1377.83 1387.87

1387.7

1386.53

1386.86 1386.90

9 1 72.85

73.6 2 74.0 3 1 73.85 6 73.72 2 74.10 2 74.3 2 74.2

74.25 74.58 2 73.66

11 1 99.44

99.56

100.5 100.4 5 101.9 101.2 12 103.4 103.65

103.5 103.59 102.92

102.40

102.88

102.46

102.63 102.22

101.65 2 101.65

104.3

7 1 (130.2) 130.3 129.6

128.7 5 1 129.7 6 135.2 18 3 130.9 9 1 132.5 5 132.5 5 2 134.7 4 133.1 5 132.3

7 164.25 4 161.7 4 162.8 5 2 162.8 5 166.6 3 168.6

162.5 3 169.1 5 169.1 174.4

163.6 2 167.4

1616.68

1617.2

1612.2

1608.8 1608.6

1608.5 1607.87 1608.80

1609.38

1609.20 1609.59

1609.26

1609.62

1610.7 1610.09

1857.0

1858.9

1848.3 1850.8

2114.4

2116.1 2115.6

2108.5 2107.8

2112.5 2108.0

2105.9 2100.45

2111.65

2106.2

1466.14

1464.8

1462.9 1462.09

1461.55 1461.97

1462.0

1460.78

1461.44 1460.56

1716.12

1716.76

1714.1

1712.2 1712.25

1712.0 1711.46

1711.72

1711.78

1712.08

1712.05 1711.89

1711.84

1712.35 1711.52

1987.2

1987.6

1983.0

1983.9

2276.1 2278.9 2278.4

2275.1 2276.4

2275.0

2277.1 2275.0

2274.85

2275.25 2273.6

Ref. (median)

Tayl

Tayl

TaRa

82

82

81 WSJT 81 WSJT 81 WPHK 82

Tayl

SLFH

82

85 WPHK 82 WPHK 82 WPHK 82

WSJT 81 WSJT 81 GMM 82 SmBl 84

Tayl

GCH

8176 KBHN 74 WPHK 82 Wagn

WPHK

7882 WPHK 82 WPHK 82 WPHK 82 WPHK 82 WPHK 82 WPHK 82 WPHK 82

Tayl

NSLS

8177

ScBr 81 PHHJ 70 PHHJ 70 WaTa 80

Bert 81 CFRS 80 BMPN 85 Wagn

Wagn

Wagn

WaTa

75

757880

Swif 82

RiVe 83 Wagn

WaTa

7880 Wagn

WaTa

78

82 Wagn

Wagn

WaTa

78

7880 Wagn

WaTa

7882 WaTa 82 WaTa 82 19
CHARLES D. WAGNER

Table 5. A subset of values for photoclectron binding energies and Auger kinetic energies for all the elements — Continued

Values in Chemical State Values in Error ( 0.5 eV)

2p KLi3L23

NaCI 5 198.6 KCI 4 198.4 KCI03 2 206.16 Kao4 2 208.33 K2PtCI4 4 1 198.7 K2PtCI6 5 1 198.9 NiC12 2 199.4 RhCI3 3 1 198.6

poly-(vinyl chloride) 200.1

ARGON

2P3

Ar(implantcd in Ar(implanted in

Fe)

graphite)

241.7

241.5

POTASSIUM

2P3 L3M2M3 L2M2M

K 294.7 KI 292.8 KBr 3 293.1 248.3 250.7 KCI 4 292.8 KF 292.8 K20sCI6 3 293.0 KSbF6 293.7

*Pcaks composed mainly of L3M23M23 and L2M23M23 respectively.

CALCIUM

2P3 L3M2M3,L2M2M3 a

Ca 345.9 298.2 644.1 CaS 346.45 CaO 4 347.3 292.5 639.8 CaCI2 3 348.3 291.9 640.2 CaF2 3 1 347.9 288.9 636.8 CaC03 4 347.0 291.8 638.5 CaS04 348.0 CaHP04 347.6 SCANDIUM

Sc 398.3 ScP 399.4 ScN 400.7 ScS 402.9 Sc203 4 401.9 334.9 736.8 ScF3 405.0 329.8 734.8

TITANIUM

2P3 L3M23V a

Ti 6 453.89 TIP 454.8 TiN 455.8 Tie 454.6 418.2 872.8 Ti02 10 2 458.7 TiC14 458.5 BaTi03 2 458.55 Na2TiF6 462.6 409.8 872.4 K2TiF6 462.1 409.4 871.5

543.6* 542.6

Ref. (median)

NSLS 77 NSLS 77 TCCW 85 TCCW 85 NSBM 80 NSBM 80 KlHe 83 NSBM 80 WRDM 79

Wagn 75 Wagn 78

PeKa 77 Wagn 75 WRDM 79 NSLS 77 Wagn 75 LZML 83 Wagn 75

VaVe 80 KMUK 77 VaVe 80 Wagn 77 Wagn 77 WRDM 79 CLSW 83 LaMa 84

MFA 85 MFA 85 STAB 76 FUMT 76 WRDM 79 AWH 81

LANM 81 MFA 85 STAB 76 WGR 79 WRDM 79 MRV 83 MWI 75 WGR 79 WGR 79 20
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

Table 5. A subset of values for photoelectron binding energies and Auger kinetic energies for all the elements — Continued

VANADIUM

V

VN

vs

V203

V205

Na3V04

V(C5H5)2

V(acac)3

CHROMIUM

Cr

ZrCr2 Cr203

Cr03

Na2Cr207

Cr(C5H5)2

CrC13 CrF3

MANGANESE

Mn

MnP

MnN

Mn203

Mn304

Mn02

MnBr2

MnC12

KMn04

IRON

FeFeP FeB

Fe3Si Fe3C

FeS2 FeO

Fe203

FeF2

Fe(C5H5)2

COBALT

Co

CoS2

CoO

CoOOH

Co(OH)2

C0AI204

C0M0O4

K3Co(CN)6

Co(NH3)6C13

Values in Chemical State Values in Error ( 0.5 eV)

2p3

10 2 512.15 2 514.3 513.9

4 2 515.8

16 6 517.65

517.3 2 512.9

514.2

10 1 574.3 573.9 16 3 576.6

4 2 580.1 4 579.8 3 574.8 2 577.8 3 1 579.4

638.78

639.0

641.3 9 1 641.6 6 641.4 7 2 642.6 2 642.1 2 642.0

647.0

2P3

19 3 706.95 2 707.1 2 707.4

707.5

708.1 5 1 706.7 6 2 709.6

14 3 710.9 2 711.4 4 707.8

6 778.2 2 778.1

13 1 780.4 2 780.3 2 781.3 3 780.8 2 781.3 3 1 781.9 4 1 781.7

LjMuV

472.0 984.15

527.2 1101.5

L3W

702.4 1409.35

773.0 1551.2

766.8

768.6

1548.7

1550.3

Ref. (median)

WRDM 79 STAB 76 FUMT 76 HSGH 81 WRDM 79 NFS 82 GSMJ 74 LFS 73

WRDM 79 RKOS 84 BDFP 81 Shut 80 NSSP 80 GSMJ 74 AlTu 76 MMP 82

LANM 81 MFA 85 CSC 72 StHe 84 INZI 82 INZI 82 Aoki 76 Aoki 76 UmRe 78

WRDM 79 MFA 85 JJH 80 ShTr 75 ShTr 75 VHVH 80 NDKS 83 WRDM 79 KaUr 79 Nefe 78

HaWi 77 VHVH 80 NFS 82 SDM 83 SDM 83 OkHi 76 KGBP 83 WGR 79 WGR 79

21
CHARLES D. WAGNER

Table 5. A subset of values for photoelcctron binding energies and Auger kinetic energies for all the elements — Continued

NICKEL

NiAI3Ni

AuNi

NiB

Ni2Si NiS

NiO

Ni203

Ni(OH)2

Ni(C0)4

NiCI2 NiA1204

NiS04

Ni(dimethylglyoxime)2

NiF2

COPPER

Cu

AI2Cu

CuP2

Cu2S

CuS

CuFeS2

CuAI204

Cu20

CuO

CuCI

CuCI2

CuF2

ZINC

Zn

ZnP2 ZnTe

ZnSe ZnS

ZnO

ZnI2 ZnBr2

ZnS04

ZnF2

GALLIUM

Ga

GaAs

GaP

GaN

AIGaAs

Ga2Se3

Ga203

GERMANIUM

Ge

GcAs2

GeTe

GeSe3

GeSe

GeS

Ge02

Ph4Ge

Na2GeF6

Values in Chemical State Values in Error ( 0.5 eV)

2P3 LsW a

18 1 852.7

853.75 852.15

853.2

846.2 1698.9

3 853.0

2 852.8

18 7 854.4 2 856.0 9 2 855.9 2 854.4 4 856.7

6 2 856.2 4 856.8 4 854.8 842.4 1697.2 3 1 857.4 842.4 1699.8

2P3 L3M4sM45 a

26 3 932.67 918.65 1851.32

933.9 918.0 1851.9

932.4 7 1 932.4

6 1 932.3 2 932.0 2 934.7 14 932.4 916.8 1849.4 16 1 933.8 917.9 1851.7

5 932.4 915.6 1848.0

7 3 934.4 915.5 1849.9

5 2 936.1 916.0 1852.1

13 2 1021.70

1020.9

992.10 2013.80

1021.6 991.3 2012.9

1022.0 989.5 2011.5

3 1021.6 989.7 2011.3

11 2 1022.1 987.7 2009.8 2 1022.5 988.7 2011.2 2 1023.4 987.3 2010.7 2 1023.0 986.2 2009.2 2 1021.8 986.2 2008.0 3d L3M4SM45 a

7 18.7 1068.1 1086.8 14 1 19.3 1066.3 1085.6 7 19.3 1065.6 1084.9

19.54 1064.5 1084.05

19.0 2 19.7 1065.6 1085.3 6 20.5 1062.4 1082.9

9 29.15

29.7 1145.2 1174.35

2 30.0 1144.8 1174.8

31.2 1141.7 1172.9 2 31.7 1142.9 1173.6

30.5 1143.7 1174.2

32.7 1137.7 1170.4

31.2

33.3 1135.7 1169.0

Ref. (median)

PEJ 82 HFBZ 82 HFBZ 82 SMS 80 GGM 82 ShRe 79 GGM 82 SMSB 81 SMSB 81 KMI 81 KIHe 83 SMSB 81 ShRe 79 WGR 79 WGR 79

AnSe 84 FKWF 77 NSDU 75 NSSP 80

Brio 80

Brio 80 SLFH 85 THC 83 WRDM 79 GaWi 77 GaWi 77 GaWi 77

Evan 85 NSDU 75 HFV 77 HFV 77 GaWi 77 GaWi 77 GaWi 77 Wagn 75 StHeS 4a GaWi 77

WRDM 79 MINN 78 NIMN 78 HeMa 80 TAYL 82

ITI 82

ITI 82 WRDM 79 HKMP 74 SFS 77 Ueno 83 Ueno 83 SFS 77 Wagn 82 HWW 74 Wagn 82

22
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

Table S. A subset of values for photoclcctron binding energies and Auger kinetic energies for all the elements — Continued

Values in Chemical State Values in Error ( 0.5 eV)

3d L3M45M4S

ARSENIC

AsNbAs

AlAs

AlGaAs

GaAs

As2Se3 As2S3

As203

As205

NaAs02

AsI3 AsBr3

Ph3AsS

Ph3As

KAsF6

SELENIUM

SeAs2Se3 GeSe2

Ga2Sc3

CuInSe2

PbSe

H2Se03

H2Se04

Se02

Ph2Se

Ph2Se2

Ph2SeO

BROMINE

CsBr RbBr KBr

NaBr

LiBr KBr03

PbBr2

K2PtBr4 K2PtBr6 Ni(NH3)6Br2

KRYPTON

Kr in Ag

KrinCu

RUBIDIUM

Rb

RbCI

STRONTIUM

SrSrO SrMo04

SrRh204

SrF2

12 41.5 1225.0 1266.5 40.8 1226.0 1266.8 2 41.0

41.0 16 41.2 1225.0 1266.2 6 1 43.0 1223.3 1266.3

43.4 1222.0 1265.5 9 3 44.9 1218.7 1263.6 4 46.1 1217.4 1263.6 2 44.3 1219.6 1263.9

43.5 1222.9 1266.4

45.3 1218.1 1263.4 2 44.1 1220.0 1264.1 4 42.76

47.8 1213.8 1261.6

18 4 55.2 6 54.9 3 54.5 3 54.6 2 53.8 2 53.4

59.0 1301.0 1360.0

61.0 1298.1 1359.1 4 58.8 1301.6 1360.4

55.8 1304.0 1359.8

55.8 1304.3 1360.1 57.6 1301.9 1359.5

4 1 68.3

68.4 3 68.7 2 68.8

68.9 1389.1 1458.1 74.8 1384.4 1459.2 2 68.7 3 69.3 2 69.2

68.7

3p3

207.6

207.3

3d5

112.0

110.1

134.4

135.3

133.5 133.0

133.75

Ref. (median)

BWWI 76 BWWI 76

Tayi 82

Tayl 82

Tayl 82 BWWI 76 BWWI 76

Tayl 82 BWWI 76

Tayl 82 BWWI 76 BWWI 76 BWWI 76 HW 79 WGR 79

CIKT 85 UeOd 82 UeOd 82

ITI 82 CIKT 85 SFS 77 BWI 81 BWI 81 BWI 81 BWI 81 BWI 81 BWI 81

NSBM 80 MVS 73 WaTa 80 ShIg 78 Wagn 78 Wagn 78 Nefe 82 NSBM 80 NSBM 80 NZB 78

CiHa 74 CiHa 74

EbSi 79 NSMN 74

VaVe 80 VaVe 80 NFS 82 NFS 82 WRDM 79 23
CHARLES D. WAGNER

Table 5. A subset of values for photoelectron binding energies and Auger kinetic energies for all the elements — Continued

Values in Chemical State Values in Error ( 0.5 eV)

3d L}M45M4S

YTTRIUM

Y

YH3

Y203

Y2(C204)3

Y2(S04)3

ZIRCONIUM

Zr

ZrCr2 ZrCr2H4

ZrH2

Zr02

ZrF4 K2ZrF6

NIOBIUM

Nb

NbN

NbSe4

NbO

Nb02

Nb205

NbI5

NbBr5

NbC15

KNb03

K2NbF7

MOLYBDENUM

Mo

MoB2

Mo2C

MoS2

Mo02

Mo03

A12(Mo04)3

C0M0O4

InMo6S8

Na2Mo04

M0CI5

RUTHENIUM

Ru

Ru02

Ru03

Ru04

RuC13

BaRu04

155.8 157.7 4 1 157.0

159.7

160.0

5 178.79

178.4

179.5 178.8 4 1 182.2

185.3 184.2

10 2 202.26

203.8

203.4

4 2 203.7

5 2 205.7

12 4 207.6

207.1

207.1 208.0

206.5 209.4

3d5 MjW

14 3 227.9

227.9

227.8

222.8

82 229.0

12 4 229.6

17 2 232.8

3 232.7 53 233.1 227.9 4 232.0 2 231.0

81 280.02 52 280.9

282.5 283.3

281.8

284.2

450.7

Ref. (median)

NyMa 80 FuSc 84 UIY 84 UIY 84 UIY 84

NyMa 80 RKOS 84 RKOS 84 CoMa 75 NGDS 75 NKBP 73 NKBP 73

NyMa 80 Bahl 75 Bahl 75 Bahl 75 Bahl 75 NFS 82 GSS 84 MSC 73 MSC 73 MSC 73 MSC 73

WaTa 80 MECC 73 BrWh 78 ZMTB 80 FlMa 82 FlMa 82 ZMTB 80 PCLH 76 MAS 85 NFS 82 GrMa 75

NyMa 80 McGi 82 KiWi 74 KiWi 74 Folk 73 OGB 80

24
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

Table 5. A subset of values for photoclectron binding energies and Auger kinetic energies for all the elements — Continued

Values in Chemical State Values in Error ( 0.5 eV)

3ds MsW

82

32

2

34 1 3

21 3

RHODIUM

Rh

Rh2S3

Rh203

RhCI3

RhI3

Na3RhC16

KRh02

Rh2Mo06

RhC13.3H20

Rh6(CO)16

K3Rh(N02)6

K3Rh(N03)6

ClRh(PPh3)3

K3RhC16

K3RhF6

PALLADIUM

Pd

A13Pd

LaPd

Pd2Si PdO

Pd02

PdC12 K2Pd(N02)4

K2PdBr4

K2PdC14

K2PdC16

Pd(NH3)4C12

Pd(PPh3)4

SILVER

Ag

AlAg2

CuAgSe

Ag2Se

Ag2S

Ag20

Ago

Agl

AgF

AgF2

*6.0 eV added to value for M5N45N45 to give value for M4N45N45

3d, CADMIUM

Cd 8 2 CdTe 9 CdSe 2 CdS 7 CdO 7 Cd(OH)2 2 CdS04

CdC03

CdI2 3 CdC12

CdF2 5

•6.8 eV added to value for M5N45N4S to give value for M4N45N45.

16

4 1 41

307.2 301.3 608.5 308.8 308.7

310.2

308.6

310.0 297.7 607.7

308.5 309.2

310.0

308.8

310.5

311.1 307.6 309.8

312.2 3d5 M4M4SM4S a

335.1 327.8 662.9

337.7

336.4 336.8

336.3 337.9

337.8 338.8

337.7

337.9 323.1 661.0

340.3

338.4 323.8 662.2

335.1 324.4 659.5 3ds M4M4SM45 a

368.28 357.84 726.12

368.7 357.7 726.4

367.8 357.3* 725.1 367.8 357.4* 725.2

367.1 357.2* 725.3 367.8 356.7* 724.5 367.4 356.6* 724.0

368.0 356.1* 724.1 367.7 355.3* 723.0

367.3 355.6* 722.9

M4N4SN4S

405.0 384.0* 789.0

405.2 382.4 787.6

405.0 381.7 786.7

405.3 381.3* 786.6 404.2 382.4* 786.6

405.1 380.0 785.1 405.4

405.1 405.4 381.2* 786.6

406.1 405.9 379.0* 784.9

Ref. (median)

WRDM 79 GiDi 84 NFS 82 AnSc 81 Nefe 78 WGR 79 NFS 82 NFS 82 FMPS 85 AWH 81 SNMK 78 SNMK 78 OUT 79 SNMK 78 SNMK 78

WRDM 79 HFBZ 82 HFBZ 82 GGM 82 KGW 74 KGW 74 CKJT 85 NZMP 73 NZMP 73 WGR 79 Nefe 78 WGR 79 WGR 79

AnSe 84 FKWF 77 RRD 78 RRD 78 RRD 78 GaWi 77 GaWi 77 GaWi 77 GaWi 77 GaWi 77

GaWi 77

Pola 82

Pola 82 GaWi 77 GaWi 77 WGR 79 RVJK 85 HGW 75 GaWi

SATD 73 GaWi 77

25
CHARLES D. WAGNER

Table 5. A subset of values for photoelectron binding energies and Auger kinetic energies for all the elements — Continued

Values in Chemical State Values in Error ( 0.5 eV)

3d5 M4N4SN4S

INDIUM

InInSb InP

In2Se3 CuInSe2

In2S3 InMo6S8

In203

InI3 InBr3

InCI3 InF3 (NH4)3InF6

*7.6 cV added to value for M5N45N45 to give value for M4N45N45.

17 4 443.84 410.41 854.2! 2 444.3 61 444.6 408.0 852.6 31 444.5 408.0 852.5 2 444.1 408.6 852.7 2 444.7

444.4

407.3 852.0

10 4 444.4 406.4 850.8 31 445.8 405.8 851.6 31 446.0 404.8 850.8 31 445.9 2 446.2 403.7 849.9

445.6 404.1 849.7

TIN

SnSnTe

SnSe SnS SnO

Sn02

Me3SnF

Ph4Sn

SnBr2

SnCI2 SnF2

SnF4

NaSnF3

ANTIMONY

SbNa3Sb

AlSb

InSb Sb2S3

Sb2S5 Sb203

SbI3 SbCI5 Ph3Sb

Ph3SbS

SbF3

KSbF6

17

31

62

11

3d5 M4N45N4S

484.87 437.27

485.6 485.7

485.6 435.7

486.9

486.6 432.6

486.7

486.3

486.9 486.7

487.4 488.2

487.4 430.8

922.7

921.3

919.2

918.2

81 528.2

528.6 528.0

464.5 992.7

990.6

41 529.5 462.1 991.6 2 529.3 462.2 991.5 2 530.0

530.4 530.9

528.9

528.7 531.7

459.7 989.7

532.9 454.4 987.3

4d,

16.76

Ref. (median)

PWA 79 VaGr 81 Bert 81 CIKT 85 CIKT 85 WGR 79 MAS 85 Bert 81 Wagn 77 Wagn 77 FHT 77 Wagn 75 Wagn 77

PWA 79 SFS 77 SFS 77 Wagn 75 WW 79 LAK 77 WW 79 MoVa 73 GZF 73 WW 79 Shut 80 Shut 80 Wagn 75

VaTr 79 BaOa 80 MSV 73 VaGr 81 Wagn 75 Wagn 75 Wagn 75 MSV 73 MSV 73 BCH 75 BCH 75 MSV 73 WGR 75

26
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

Table 5. A subset of values for photoelectron binding energies and Auger kinetic energies for all the elements — Continued

Values in Chemical State Values in Error ( 0.5 eV)

3d, M4N45N45 4d<

TELLURIUM

Te

SnTe PbTe

CdTe

Ga2Te3

GeTe

GeTe3As

Te02

Te03

Te(OH)6

Na2Te04

TeI4 TeBr4

TeC14 (NH4)2TeC16

Ph2Te2

Ph2TeC12

IODINE

12UI3

Lil NaT

NiI2 Agl

NbI4

HI03

NaI03

NaI04

ICl IC13 I205

7 4 572.85

572.3 572.0

492.13 1064.98 40.2(

8 572.7 490.8 1063.5 572.4 40.3 572.7 40.2 572.5 6 576.1 487.1 1063.2 43.4 21 577.3 485.5 1062.8 44.6

577.1 485.1 1062.2 45.0 576.8 485.5 1062.3 575.8 43.8 576.7 487.3 1064.0 44.0 576.9 486.1 1063.0 44.3 576.9 486.4 1063.3 45.3 573.9 488.5 1062.4 42.8 576.2 486.3 1062.5 43.8

3ds M4N45N4S

619.9 519.0 1138.9

620.3 517.3 1137.6

1 619.7 618.4517.0 1136.7

619.0 518.8* 1137.8 619.4 518.3* 620.0

1137.7

623.1 623.5 624.0

621.5

622.5 623.3

*11.5 eV added to value for M5N45N45 to provide value for M4N45N45. XENON

Xe (implanted in graphite)

Xe (implanted in Ag)

Na4Xe06

CESIUM

CsCsN3

Cs20

CsOH

Cs2S04

Cs3P04

Csl CsCI CsC104 CsF

2

21

723.9

723.9 724.0

724.2

724.0

Ref. (median)

PWA 79 SFS 77 SFS 77

Pola 82 TIWB 72 SFS 77 HKMP 74 BWI 77 BWI 77 BWI 77 Wagn 75 BWI 77 BWI 77 BWI 77 BWI 77 BWI 77 BWI 77

DMKK 84 DMKK 84 WRDM 79 Sher 76 GaWi 77 GaWi 77 GSS 84 Sher 76 Sher 76 Sher 76 Sher 76 Sher 76 Sher 76

669.65 545.2 1214.85

669.6

674.1 541.4 1215.5

3d5 M4N45N45 a 4d5

726.3 77.5 723.6

77.6 724.15 568.7 1292.85 723.9 568.4 1292.3

WRDM 79 CiHa 74 Wagn 77

EbSi 79 SGRS 72 EbSi 79 WRDM 79 Wagn 77 MVS 73 MVS 73 NSMN 74 MVS 73 MVS 73 27
CHARLES D. WAGNER

Table 5. A subset of values for photoelectron binding energies and Auger kinetic energies for ail the elements — Continued

Values in Chemical State Values in Error ( 0.5 eV)

3d5 M4N45N45 4d5

BARIUM

BaBaH2

BaS BaO

BaC03

Ba(N03)2

BaS04

BaCr04

BaF2

LANTHANUM

LaLaH2

LaH3

La203

La2(S04)3

La2(C204)3

LaCr03

CERIUM

Ce

CeA12

CePd3

CeH2

CeH3

CeSe Cc02

PRASEODYMIUM

PrPrH2

PrH3

Pr203

Pr02

Pr2(S04)3

Pr2(C204)3

NEODYMIUM

Nd2(S04)3

Nd2(C204)3

PROMETHIUM

PmC13

SAMARIUM

Sm

Sm203

Sm2(S04)3

Sm2(C204)3

EUROPIUM

EuEu203

Eu2(S04)3

Eu2(C204)3

GADOLINIUM

Gd

Gd2(S04)3

Gd2(C204)3

41 780.6 782.0

779.8

601.0 1381.6 90.2

41 779.9

779.9

780.7

598.0 1377.9 89.8

41 780.8

778.9 5%.l 1376.9

781.7 594.9 1376.6 3d5 4d5

2 835.9

837.2 2 838.8 42 834.8

837.4 837.2 833.0

102.1 104.4

104.6 101.7

31 883.9

883.5

884.3 885.8

109.1

2 886.0

884.3 41 881.93

932.0

933.2

934.2 2 933.6 935.3

936.1 935.8

984.9 984.7

116.1 116.2

116.8

116.8

122.5

122.1

1033.5

1081.2

1084.3

1085.6

1085.5

1135.6

1137.9 1136.4

1190.0

1189.8

128.3

131.0

132.9 132.8

128.4

135.6

137.5

135.1

141.7

143.8

144.4

Ref. (median)

KoGr 85 FMUK 77 SiWo 80 KoGr 85 CLSW 83 CLSW 83 Wagn 77 ACHT 73 SeSo 84

SOS 82 SOS 82 SOS 82 UIY 84 UIY 84 UIY 84 HoTh 80

SOS 82 LFBC 80 LFBC 80 SOS 82 SOS 82 LFBC 80 BFCB 83

FuOs 84 FuOs 84 FuOs 84 SaRa 80 SaRa 80 UIY 84 UIY 84

UIY 84 UIY 84

MNTB 70

DKMB 76 UIY 84 UIY 84 UIY 84

NNBF 68 UIY 84 UIY 84 UIY 84

TeLe 79 UIY 84 UIY 84

28
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

Table 5. A subset of values for photoelectron binding energies and Auger kinetic energies for all the elements — Continued

Values in Chemical State Values in Error ( 0.5 eV)

TERBIUM

Tb203

Tb02

Tb2(S04)3

Tb2(C204)3

DYSPROSIUM

Dy203

Dy203

Dy2(S04)3

Dy2(C204)3

HOLMIUM

Ho2(S04)3

Ho2(C204)3

ERBIUM

Er203

Er2(C204)3

THULIUM

Tm203

Tm2(S04)3

Tm2(C204)3

YTTERBIUM

Yb

Yb203

Yb2(S04)3

Yb2(C204)3

LUTETIUM

LuLu203

Lu2(S04)3

Lu2(C204)3

HAFNIUM

Hf

Hf02

TANTALUM

Ta

TaSi2 TaS2

Ta205

KTa03

TaBrS

TaCI5 TaF5

K2TaF7

3d<

124L5

1241.4

1298.9

42

34 1

4f

14.23

16.7

4f7

21.9 27.0

26.7

26.5 25.9

26.9

27.3 27.8

29.4

MjN^NtT

1674.65 1696.6

4d5 Ref. (median)

148.7 SaRa 80

149.2 SaRa 80

150.5 UIY 84

150.9 UIY 84

SaRa 80

155.8 UIY 84

156.5 UIY 84

156.0 UIY 84

162.8 UIY 84

163.3 UIY 84

168.8 UIY 84

170.7 UIY 84

176.6 UIY 84

178.3 UIY 84

178.3 UIY 84

183.0 PLNW 77

185.2 UIY 84

187.3 UIY 84

187.3 UIY 84

196.6 PLNW 77

196.5 UIY 84

198.5 UIY 84

198.7

4d5

UIY 84

211.5 NBM 80

213.0 SaRa 80

4d5

WaTa 80

231.1 MSC 73

230.8 MSC 73

230.4 SaRa 80

229.8 MSC 73

231.2 MSC 73

231.0 MSC 73

231.6 MSC 73

234.9 NKSP 73

29
CHARLES D. WAGNER

Table 5. A subset of values for photoelcctron binding energies and Auger kinetic energies for all the elements — Continued

Values in Chemical State Values in Error ( 0.5 eV)

4f7 M5N«N67

TUNGSTEN

W

wc

WS2

W02

W03

AI2(W04)3

Na2W04

H2W04

Li2W04

CuW04

WBr5

WBr6

WC14

WCI6

RHENIUM

ReRe02

Re207

K2Rc04

NH4Rc04

K2ReBr6

K2RcCI6

OSMIUM

OsOs02

K20s04

K20sI6

K20sCI6

OsCI3 K20s02(OH)4

060s(C5H5N)4

Os(NH3)5N2I2

IRIDIUM

IrIr02

IrCI3 IrCI4(PEt3)2

IrCIN2(PPh3)2 K2IrBr6

K2IrCI6 K3IrBr6

K3IrCI6 K3Ir(CN)6

9 31.32

31.5 33.2 1727.8 1761.0 8 3 32.7 12 2 35.7 4 1 36.3 36.3 1722.0 1758.3

36.1 1723.9 1760.0 2 36.0

36.1 1725.3 1761.4

36.3

35.9

34.9

36.6

4f7

8 1 40.46 3 1 43.2 46.7 46.07

46.2

43.5 3 44.0

4 50.7 2 1 52.0

51.9

5 1 53.2

53.1 55.2

53.8

50.9

6 60.75 2 62.0

62.7

63.6 60.7

62.6 4 1 63.5 61.8

62.5 61.8

4d5 Ref. (median)

243.5 NBM 80 CoRa 76 Wagn 75 CoRa 76 CoRa 76 SMSB 81 Wagn 75 Wagn 78

247.6 MSC 73 Wagn 78

247.6 MSC 73

247.7 MSC 73 GMW 85 GMW 85

4d,

260.5 BMNN 79 KOAG 83 CDGV 80 TCCW 85 KOAG 83 NSSK 80 NSSK 80

278.5 BNMN 79

280.1 SaRa 80

283.6 SaRa 80 Nefe 78 LZML 83 Nefe 78 Nefe 78 LZML 83 Folk 73

296.3 NBM 80 Peuc 84 Folk 73 LeBr 72

Folk 73 Nefe 78 KSPB 76 Nefe 78 NBSN 77

InFl 84

30
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

Table 5. A subset of values for photoelcctron binding energies and Auger kinetic energies for all the elements — Continued

Values in Chemical State Values in Error ( 0.5 eV)

4f7

PLATINUM

PtPt

PtSi Pt2Si PtO

Pt02

Pt(0H)2

Pt(OH)4

Pt(OAc)2

PtCI2

PtCI4 K2PtI6 K2PtCI4 K2PtCI6 K2PtF6

K2Pt(OH)6

K2Pt(N02)6

Pt(NH3)6CI4

Pt(PPh3)3

GOLD

Au

Au

Au

Au203

(PPh3)AuCI

(PPh3)2Aua

(PPh3)AuC13

(PPh3)AuI

(PPh3)8Au9(N03)3

(PPh3)AuN03

(PPh3)4Au(CI04)

Line N7VV.

MERCURY

Hg

HgS

HgO

Hg3P04

Hg2S04

Hg2(N03)2

Hg2I2

HgI2

Hg2CI2

HgCI2

HgF2

Hg2C204

THALLIUM

TlTIS T1S3 TI203

Til TIBr

TICI TIF

2

13

3 1 4 2

13

52

2

2

32

71.07

71.2 73.0

72.5 74.2 75.0

72.6

74.6 73.8

73.6

75.5 73.4 73.0

75.5 77.6

75.1 75.9

76.3

71.4

4f7

83.97

84.1 84.0

85.9

85.3 85.2

87.5 85.4 85.0

85.4 85.0

4f7

4 99.9

100.8 2 100.8

101.1 101.0

101.2 100.9

100.7

100.8

101.4

101.2

101.1

3 117.73

118.7 118.7

117.5

118.5 119.2 119.0

119.2

M5N67N«7

2015.8

2015.7

M4N«7N«

4d,

314.6

317.3

318.1

316.7 318.6

316.1 318.6

4d5

334.7 2099.9 69.8* 335.1 2099.7 2101.6

4d5

359.3

385.0

385.5 385.3 384.7

385.4

386.1 385.7

386.1

Ref. (median)

NBM 80 Wagn 75 GGM 82 GGM 82 EPCC 75 EPCC 75 HaWi 77 PCB 84 RCMS 80 EPCC 75 EPCC 75 NSBM 80 Wagn 75 NSBM 80 NSBM 80 NSBM 80 NSBM 80 NSBM 80 Rigg 72

VaTr 79 PEJ 82 WaTa 80 PLTD 84 MBSG 80 MBSG 80 MBSG 80 BMCK 82 BMZN 82 BMCK 77 MBSG 80

SMBM 76 NSSP 80 NSSP 80 NSK 79 NSK 79 NSK 79 NSK 79 SATD 73 NSK 79 SATD 73 SATD 73 NSK 79

MBN 80 MSC 73 MSC 73 MSC 73 MSC 73 MSC 73 MSC 73 MSC 73

31
CHARLES D. WAGNER

Table 5. A subset of values for photoelectron binding energies and Auger kinetic energies for all the elements — Continued

Values in Chemical State Values in Error ( 0.5 eV)

4f7 M5N„N«7 M4Nt,N« 4d5

LEAD

Pb

Pb

Pb

PbTe

PbSe

PbS

PbO

Pb02

Pb(OH)2

Pb(OAc)2

Pb(OAc)4

PbS04

PbSi03

PbI2 PbC12 PbF2

Pb(I04)2

Ph4Pb

BISMUTH

BiBi2Sc3 Bi2S3 BiOCl

Bi2Mo06

NaBiOS

BiI3 BiF3

Ph3Bi

THORIUM

Th

Th02

Th(OAc)4

Th3(P04)4

ThCI4

ThC14

ThF4

ThF4

122

2

4

146 1 2

3

4 2

2 1

136.78

137.0 2180.3

4f7 N»04S045

136.8 96.25 137.25 95.45

137.6 94.75

137.5 94.55

137.25 92.85

137.4 93.05

137.95 91.95

138.5 91.45 137.2

140.0 90.1 138.65 91.1 138.35 93.35

138.9 92.1 138.5 90.6 138.2 92.7 138.2

4f7

156.88

158.9

159.9

159.6

159.1 159.3 160.8

333.1 334.6

335.7

336.9

2317.3

233.05

232.7 232.35

232.05

230.1 230.45 229.9 229.95

230.1 229.75

231.7

231.0

229.1 230.9

5d5

25.0

25.37

85.4 87.0

87.3

87.5

86.2

2282.1

412.0

4d<

413.3

4d,

440.3

Ref. (median)

NBM 80 WaTa 80

Pede 82 Pede 82 Pede 82 Pede 82 Pede 82 Pede 82 Pede 82 Pede 82 BeFI 80 Pede 82 Pede 82 Pede 82 Pede 82 Pede 82 Pede 82 MoVa 73

675.2

675.7

VaTr 79 TSH 84 MSV 73 MSV 73 WS 85 MSV 73 MSV 73 MSV 73 HW 79

ScLa 81 VLDH 77 NMSI 74 NMSI 74 ATT 83 NMSI 74 ATT 83 NMSI 74

32
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

Table 5. A subset of values for photoelectron binding energies and Auger kinetic energies for all the elements — Continued

Values in Chemical State Values in Error ( 0.5 eV)

4f7

URANIUM

U

UTc3 use

USe3

US

US3

U02

U308

U03

UOBr2

UOCl

UOC12

U02Br

U02Br2

U02F2

U(S04)2

U02Mo04

UI3

UBr4

UC13

UC14

UF4

UF6

K2UF6

PLUTONIUM

Pu203

Pu02

AMERICIUM

Am(OH)3

11 2 377.4

381.3 380.3

379.1

380.1 379.4 10 1 380.2 4 380.7 6 381.3

380.4 380.0

380.3

380.5

381.1 2 383.0

381.6 381.0

379.0

379.9

378.3 2 1 380.2 5 382.2

384.9

382.4

2 424.7 2 426.2

5d<

94.0

4d5

736.4

97.0

97.3 97.6

97.5

449.1 109.2 831.8

Ref. (median)

ScLa 81 SNRS 76 SNRS 76 SNRS 76 SNRS 76 SNRS 76 FSL 85 FSL 85 DBLG 83 TBVL 82 TBVL 82 TBVL 82 TBVL 82 TBVL 82 TBVL 82 Chad 73 FSL 85 DMKK 84 TBVL 82 TBVL 82 TBVL 82 TBVL 82 TrRi 82 PMDS 77

CCHB 81 CCHB 81

KrWu 72

33
CHARLES D. WAGNER

Appendix A. Long References

ACCT74 Allen, G. C, Crofts, J. A., Curtis, M. T., Tucker, P. M., Chadwick, D., Hampson, P. J., J. Chcm. Soc. Dalton Trans. 1974, 1296 AKHM84 Asami, K., Kimura, H. M., Hashimoto, K., Masumoto, T., Yokoyama, A., Komiyama, H., Indue, H.,

J. Non-Cryst. Solids 64, 149 (1984) BACB75 Bancroft, G. M., Adams, I., Coatsworth, L. L., Bennewitz, C. D., Brown, J. D., Westwood, W. D., Anal. Chem. 47, 586 (1975) BBFR77+ Best, S. A., Brant, P., Feltham, R. D., Rauchfuss, T. B., Roundhiil, D. M., Walton, R. A., Inorg. Chem. 16, 1977 (1977) BGMN76+ Baranovski, I. B., Golubnichaya, M. A., Mazo, G. Ya., Nefedov, V. I., Salyn, Ya. V., Shchelokov, R. N., Zh. Neorg. Khim. 21, 1085 (1976) BaGaSO Bates, C. W., and Galan, L. E., Proc. Ninth Imeko Symposium On Photon Detectors, Budapest, Hungary, 9-12 Sept. (1980), Pages 100-129 CDFM82 Capece, F. M., Dicastro, V., Furlani, C, Mattogno, G., Fragale, C, Gargano, M., and Rossi, M.,

J. Electron Spectrosc. Relat. Phenom. 27, 119 (1982) CGGM81 Cheung, N. W., Grunthancr, P. J., Grunthaner, F. J., Mayer, J. W., and Ullrich, B. M.

J. Vac. Sci. Technol. 18, 917 (1981) CSFG79 Contour, J. P., Salesse, A., Froment, M., Garreau, M., Thevenin, J., and Warin, D.,

J. Microsc. Spectrosc. Electron. 4, 483 (1979) FDBS82 Farrow, R. F. C, Dennis, P. N. J., Bishop, H. E., Smart, N. R., Wotherspoon, J. T. M., Thin Solid Films 88, 87 (1982) FMPB81 Furlani, C, Mattogno, G., Polzonetti, G., Barbieri, R., Rivarola, E., Silvestri, A., Inorg. Chim. Acta 52, 23 (1981) FMUK77 Franzcn, H. F., Merrick, J., Umana, M., Khan, A. S., Peterson, D. T., McCreary, J. R., Thorn, R. J.,

J. Electron Spectrosc. Relat. Phenom. 11, 439 (1977) GGVL79 Grunthaner, F. J., Grunthaner, P. J., Vasquez, R. P., Lewis, B. F., Maserjian, J., and Madhukar, A.

J. Vac. Sci. Technol. 16, 1443 (1979) GHHL70 Gelius, U., Heden, P. F., Hedman, J., Lindberg, B. J., Mannc, R., Nordberg, R., Nordling, C, and Siegbahn, K., Phys. Scr. 2, 70 (1970) HBBK72 Hedman, J., Baer, Y., Bcrndtsson, A., Klasson, M., Leonhardt, G., Nilsson, R., and Nordling, C.

J. Electron Spectrosc. Relat. Phenom. 1, 101 (1972) HKMP74+ Hollingcr, G., Kumurdjian, P., Mackowski, J. M., Pcrtosa, P., Porte, L., Due, Tran Minh,

J. Electron Spectrosc. Relat. Phenom. 5, 237 (1974) HKNN71 Hedman, J., Klasson, M., Nilsson, R., Nordling, C, Sorokina, M. F., Kljushnikov, O. I., Nemnonov, S. A., Trapcznikov, V. A., Zyranov, V. G., Phys. Scr. 4, 195 (1971) HaEd72 Hayes, R. G., Edelstein, N., "Electron Spectroscopy", D. A. Shirley, Editor, North-Holland, Publishing Company, London, 1972, P. 771 KBHN74 Klasson, M., Berndtsson, A., Hedman, J., Nilsson, R., Nyholm, R., and Nordling, C,

J. Electron Spectrosc. Relat. Phenom. 3, 427 (1974) KGBP83 Kasztelan, S., Grimblot, J., Bonnelle, J. P., Payen, E., Toulhoat, H., Jacquin, Y., Appl. Catal. 7, 91 (1983) KJID81 Kazmerski, L. L., Jamjoum, O., Ireland, P. J., Deb, S. K., Mickelsen, R. A., and Chen, W.

J. Vac. Sci. Technol. 19, 467 (1981) KNNH68 Karlsson, S. -E., Norberg, C. H., Nilsson, O., Hogberg, S., El-Farrash, A. H., Nordling, C, Siegbahn, K., Arkiv Fur Fysik 38, 349 (1968) KrWu72 Krause, M. O., Wuilleumicr, F., "Electron Spectroscopy", D. A. Shirley, Editor, North-Holland Publishing Company, London, 1972

LHJG70-I- Lindberg, B. J., Hamrin, K., Johansson, G., Gelius, U., Fahlmann, A., Nordling, C, Siegbahn, K., Phys. Scr. 1, 286 (1970) 34

I
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

LMSL83 Lindberg, B., Maripuu, R., Siegbahn, K., Larsson, R., Golander, C -G., Erikkson, J. C,

J. Coll. Interface Sci. 95, 308 (1983) MMSB77 Martensson, N., Malmquist, P. A., Svensson, S., Basilier, E., Pireaux, J. J., Gelius, U., Siegbahn, K., Nouveau J. Chim. 1, 191 (1977) MWLF78+ Moses, P. R., Wier, L. M., Lennox, J. C, Finklea, H. O., Lenhard, F. R., Murray, R. W.,

Anal. Chem. 50, 576 (1978)

NKBP73 Nefedov, V. I., Kokunov, Y. V., Buslaev, Y. A., Porai-koshits, M. A., Gustyakova, M. P., and Ili'n, E. G., Zh. Neorg. Khim. 18, 931 (1973) NMSI74 Nefedov, V. I., Molodkin, A. K., Salyn, Y. V., Ivanova, O. M., Porai-Koshits, M. A., Balakaeva, T. A., and Belyakova, Z. V., Zh. Neorg. Khim. 19, 2628 (1974) NNBF68 Nilsson, O., Norberg, C. H., Bergmark, J. E., Fahlman, A., Nordling, C, Siegbahn, K., Helv. Phys. Acta 41, 1064 (1968) NPBS74+ Nefedov, V. I., Prokofeva, I. V., Bukanova, A. E., Shubochkin,, L. K., Salyn, Y. V., Pershin, V. L., Zh. Neorg. Khim. 19, 1578 (1974) NSKB73+ Nefedov, V. I., Schubochkina, E. F., Kolomnikov, I. S., Baranovskii, I. B., Kukolev, V. P., Golubnichaya, M. A., Schubochkin, L. K., Porai-Koshits, M. A., and Volpin, M. E., Zh. Neorg. Khim. 18, 845 (1973) NSMS79 Nefedov, V. I., Salyn, Y. V., Moiseev, I. I., Sadovskii, A. P., Berenbljum, A. S., K Nizhnik, A. G., Mund, S. L., Inorg. Chim. Acta 35, U43 (1979) NZMP73 + Nefedov, V. I., Zakharova, I. A., Moiseev, I. I., Porai-koshits, M. A., Vargoftik, M. N., Belov, A. P., Zh. Neorg. Khim. 18, 3264 (1973) PMDS77 Pireaux, J. J., Martensson, N., Didriksson, R., Siegbahn, K., Riga, J., Verbist, J., Chem. Phys. Lett. 46, 215 (1977) PRCV77+ Pireaux, J. J., Riga, J., Caudano, R., Verbist, J. J., Delhalle, J., Delhalle, S., Andre, J. M., Gobillon, Y., Phys. Scr. 16, 329 (1977) PWA79 Pessa, M., Vuoristo, A., Vulli, M., Aksela, S., Vayrynen, J., Rantala, T., Aksela, H., Phys. Rev. B 20, 3115 (1979) RSKC82 Rogers, J. D., Sundaram, V. S., Kleiman, G. G., Castro, C. G. C, Douglas, R. A., and Peterlevitz, A. C.

J. Phys. F. 12, 2097 (1982) SBDL83 Schuhl, Y., Baussart, H., Delobel, R., Le Bras, M., Leroy, J., Gengembre, L., G Rimblot, J.,

J. Chem. Soc. Faraday Trans. I 79, 2055 (1983) SMBM76 Svensson, S., Martensson, N., Basilier, E., Malmqvist, P. A., Gelius, U., Siegbahn, K.,

J. Electron Spectrosc. Relat. Phenom. 9, 51 (1976) SNS 58 Siegbahn, K., Nordling, C, Sokolowski, E., Proc. Rehovoth Conf. Nucl. Struct., Pp. 291, Sept. 8-14, 1957, Lipkin, H. J., Ed, North-Holland Pub. Co., Amster- dam, (1958) SZNS77+ Salyn, J. V., Zumadilov, E. K, Nefedov, V. I., Scheibe, R., Leonhardt, G., Beyer, L., Hoyer, E., Z. Anorg. Allg. Chem. 432, A275, (1977) TSSS83 Taniguchi, M., Suga, S., Seki, M., Sakamoto, H., Kanzaki, H., Akahama, Y., Terada, S., Endo, S., Narita, S., Solid State Common. 45, 59 (1983) WSW77-(- Van De Vondel, D. F., Van Der Kelen, G. P., Schmidbaur, H., Wolieben, A., Wagner, F. E., Phys. Scr. 16, 364 (1977) WPHK82-I- Wagner, C. D., Passoja, D. E., Hillery, H. F., Kinisky, T. G., Six, H. A., Jansen, W. T., and Taylor, J. A.,

J. Vac. Sci. Technol. 21, 933 (1982) WRDM79 Wagner, C. D., Riggs, W. M., Davis, L. E., Moulder, J. F., and Muilenberg, G. E., "Handbook Of X-Ray Photoelectron Spectroscopy", Perkin-Elmer Corporation, Physical Electronics Division, Eden Prairie, Minn., 55344, 1979 Wagn77 Wagner, C. D., Chapter 7 In "Handbook Of X-Ray and Ultraviolet Photoelectron Spectroscopy", D. Briggs, Editor, Heyden and

Sons, London (1977)

35
CHARLES D. WAGNER

YNAB77 Yatsimirskii, K. B., Nemoshalenko, V. V., Aleshin, V. G., Bratushko, Y. I., Moiseenko, E. P., Chem. Phys. Lett. 52, 481 (1977) YNNA74 + Yatsimirskii, K. B., Nemoshalenko, V. V., Nazarenko, Y. P., Aleshin, V. G., Zhilinskaya, V. V., Taldenko, Y. D., Dokl. Akad. Nauk SSSR (Phys. Chem. ) 217 835 (1974) YNNA77 + Yatsimirskii, K. B., Nemoshkalenko, V. V., Nazarenko, Y. P., Aleshin, V. G., Zhilinskaya, V. V., Tomashevsky, N.

A.,

J. Electron Spectrosc. Relat. Phenom. 10, 239 (1977) ZSTM81 + Zakharova, I. A., Salyn, Ya. V., Tatjanenko, L. V., Mashkovsky, Yu. Sh., Ponticelli, G.,

J. Inorg. Biochem. 15, 89 (1981)

36
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

Appendix B. References

ABN 78 Allred, A. L., Bradley, C, and Newman, T. H.,

J. Am. Chem. Soc. 100, 5081 (1978) ACHT73+ Allen, G. C, Curtis, M. T., Hooper, A. J., Tucker, P. M.,

J. Chem. Soc. Dalton Trans. 1973, 1677 ACHT74 Allen, G. C, Curtis, M. T., Hooper, A. J., Tucker, P. M.,

J. Chem. Soc. Dalton Trans. 1974, 1525 ACW 81 Andrews, P. T., Collins, T., and Weightman, P.,

J. Phys. C. 14, L957 (1981) ADPS77 Ansell, R. O., Dickinson, T., Povey, A. F., Sherwood, P. M. A.,

J. Electron Spectrosc. Reiat. Phenom. 11, 301 (1977) ALMP82 Anderson, C. R., Lee, R. N., Morar, J. F., and Park, R. L.,

J. Vac. Sci. Techno!. 20, 617 (1982) AMFL74 Armour, A. W., Mitchell, P. C. H., Foikesson, B., Larsson, R.,

J. Less Common Metals 36, 361 (1974) AMZG82 + Andreocci, M. V., Mattogno, G., Zanoni, R., Giannoccaro, P., VasapoUo, G.,

Inorg. Chem. Acta 63, 225 (1982) ATBB72+ Adams, L, Thomas, J. M., Bancroft, G. M., Butler, K. D., Barber, M.,

J. Chem. Soc. Chem. Commun. 1972, 751 ATW 78 Allen, G. C, Tucker, P. M., and Wild, R. K.,

J. Chem. Soc. Faraday Trans. II 74, 1126 (1978) AWH 81 Andersson, S. L. T., Watters, K. L., and Howe, R. F.,

J. Catal. 69, 212 (1981) AWL 80 Atzrodt, V., Wirth, T., and Lange, H., Phys. Status Solidi (A) 62, 531 (1980)

Alcse71 Aksela, S., Z. Physik. 244, 268 (1971) AlTu73 Allen, G. C, Tucker, P. M.,

J. Chem. Soc. Dalton Trans. 1973, 470 AITu76+ Allen, G. C, Tucker, P. M.,

Inorg. Chim. Acta 16, 41 (1976) AnLa77+ Andersson, C, Larsson, R., Chem. Scr. 11, 140 (1977) AnSc79 Andersson, S. L. T., Scurrell, M. S., J. Catal. 59, 340 (1979) AnSc81 Andersson, S. L. T., Scurrell, M. S., J. Catal. 71, 233 (1981) AnSe84 Anthony, M. T., Seah, M. P., Surf. Interface Anal. 6, 95 (1984) AnSw74 Anderson, P. R., Swartz, W. E., Inorg. Chem. 13, 2293 (1974) Aoki76 Aoki, A., Jpn. J. Appl. Phys. 15, 305 (1976) ArWa83 Armstrong, J. E., Walton, R. A., Inorg. Chem. 22, 1545 (1983) Asam76 Asami, K.,

J. Electron Spectrosc. Relat. Phenom. 9, 469 (1976) BALS76+ Bancroft, G. M., Adams, I., Lampe, H., Sham, T. K.,

J. Electron Spectrosc. Relat. Phenom. 9, 191 (1976)

37
CHARLES 0. WAGNER

BANM81 + Bohmann, O., Ahlberg, P., Nyholm, R., Martensson, N., Siegbahn, K., Lehn, J. M., Chem. Scr. 18, 44 (1981) EBB 79+ Brant, P., Benner, L. S., and Balch, A. L,

Inorg. Chem. 18, 3422 (1979) BBG 79 Barlow, S. M., Bayat-Mokhtari, P. and Gallon, T. E.,

J. Phys. C. 12, 5577 (1979) BBHF79 Bianconi, A., Bachrach, R. Z., Hagstrom, S. B. M., Flodstrom, S. A., Phys. Rev. B 19, 2837 (1979) BBLW78 + Barton, J. K., Best, S. A., Lippard, S. J., Walton, R. A.,

J. Am. Chem. Soc. 100, 3786 (1978) BCDH73 Barber, M., Connor, J. A., Derrick, L. M. R., Hall, M. B., Hillier, I. H.,

J. Chem. Soc. 1973, 560 BCGH72 Barber, M., Connor, J. A., Guest, M. F., Hall, M. B., Hillier, I. N., Meredith, W. N. E., Discuss. Faraday Soc. 54, 220 (1972) BCGH73 Barber, M., Connor, J. A., Guest, M. F., Hillier, I. H., Schwarz, M., Stacey, M.,

J. Chem. Soc. Faraday Trans. II 69, 551 (1973) BCH 75 + Birchall, T., Connor, J. A., and Hillier, I. H.,

J. Chem. Soc. Dalton Trans. 1975, 2003 BCHM72 Barber, M., Connor, J. A., Hillier, I. H., Meredith, W. N. E.,

J. Electron Spectrosc. Relat. Phenom. 1, 110 (1972) BCKK73+ Briggs, D., Clark, D. T., Keable, H. R., Kilner, M.,

J. Chem. Soc. Dalton Trans. 1973, 2144 BCM 78 Barbaray, B., Contour, J. P., and Mouvier, G., Env. Sci. Technol. 12, 1294 (1978) BCPB81 + Bancroft, G. M., Chan, T., Puddenphatt, R. J., Brown, M. P., Inorg. Chim. Acta 53, L119 (1981) BDFP81 Battistoni, C, Dormann, J. L. Fiorani, D., Paparazzo, E., Viticoli, S., Solid State Commun. 39, 581 (1981) BDH 74 Barrie, A., Drummond, I. W., and Herd, Q. C,

J. Electron Spectrosc. Relat. Phenom. 5, 217 (1974) BEB 76 + Brant, P., Enemark, J. H., and Balch, A. L.,

J. Organometal. Chem. 114, 99 (1976) BFCB83 Barr, T. L., Fries, C. G., Cariati, F., Bart, J. C. J., Giordano, N.,

J. Chem. Soc. Dalton Trans. (1983) 1825 BFHL83 Bennett, P. A., Fuggle, J. C, Hillebrecht, F. U., Lenselink, A., Sawatzky, G. A., Phys. Rev. B 27, 2194 (1983) BFVB74+ Burger, K., Fluck, E., Varhelyi, C, Binder, H., Speyer, I., Z. Anorg. Allg. Chem. 408, 304 (1974) BGD 75 Bonnelle, J. P., Grimblot, J., and D'huysser, A.,

J. Electron Spectrosc. Relat. Phenom. 7, 151 (1975) BGPW81 + Brisdon, B. J., Griffin, G. F., Pierce, J., Walton, R. A.,

J. Organometal. Chem. 219, 53 (1981) BHHK70 Baer, Y., Heden, P. F., Hedman, J., Klasson, M., Nordling, C, Siegbahn, K., Phys. Scr. 1, 55 (1970) BHMS81 + Boehland, H., Hanay, W., Meisel, A., Scheibe, R., Z. Chem. 10, 372 (1981) BHS 80 Breeze, P. A., Hartnagel, H. L., and Sherwood, P. M. A.,

J. Electrochem. Soc. 127, 454 (1980) BHU 81 Broclawik, E., Haber, J., and Ungier, L.,

J. Phys. Chem. Solids 42, 203 (1981)

38
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

BJP 79 Baker, J. M., Johnson, R. W., and Pollak, R. A.,

J. Vac. Sci. Technol. 16, 1534 (1979) BKSS81 Beyer, L., Kirmse, R., Stach, J., Szargan, R., Hoyer, E., Z. Anorg. Allg. Chem. 476, 7 (1981) BMCK77+ Battistoni, C, Mattogno, G., Cariati, R, Kaldini, L., Sgamellotti, A., Inorg. Chim. Acta 24, 207 (1977) BMM 84+ Battistoni, C, Mattogno, G., and Mingos, D. M. P., Inorg. Chim. Acta 86, U9 (1984) BMW 80+ Brisdon, B. J., Miaiki, W. S., and Walton, R. A.,

J. Organometal. Chem. 187, 341 (1980) BMZN82 Battistoni, C, Mattogno, G., Zanoni, R., Naldini, L.,

J. Electron Spectrosc. Relat. Phenom. 28, 23 (1982) BNMN79 Berndsson, A., Nyholm, R., Martensson, N., Nilsson, R., Hedman, J., Phys. Status Solid! (B) 93, K103 (1979) BNSA70 Blackburn, J. R., Nordberg, C. R., Stevie, F., Albridge, R. G., Jones, M. M.,

Inorg. Chem. 9, 2374 (1970) BOA 80 Baer, Y., Ott, H. R., and Andres, K., Solid State Commun. 36, 387 (1980) BPDN83 + Battistoni, C, Paparazzo, E., Dumond, Y., Nogues, M.,

Solid State Commun. 46, 333 (1983) BSRR81 Bhide, V. G., Salkalachen, S., Rastogi, A. C, Rao, C. N. R., and Hegde, M. S.

J. Phys. D. 14, 1647 (1981) BTE 77 Burger, K., Tschismarov, F., and Ebel, H.,

J. Electron Spectrosc. Relat. Phenom. 10, 461 (1977) BVK 83 Brabers, V. A. M., Van Setten, F. M., and Knapen, P. S. A.,

J. Solid State Chem. 49, 93 (1983) BVWW80 Bates, C. W., Van Attekum, P. M. T. M., Wertheim, G. K., West, K. W., Buchanan, D. N. E.

Phys. Rev. B 22, 3968 (1980) BWI 77 Bahl, M. K., Watson, R. L., and Irgolic, K. J., J. Chem. Phys. 66, 5526 (1977) BWI 78 Bahl, M. K., Watson, R. L., and Irgolic, K. J.,

J. Chem. Phys. 68, 3272 (1978) BWI 79 Bahl, M. K., Watson, R. L., and Irgolic, K. J., Phys. Rev. Lett. 42, 165 (1979) BWI 80 Bahl, M. K., Watson, R. L., and Irgolic, K. J.,

J. Chem. Phys. 72, 4069 (1980) BWWI76+ Bahl, M. K., Woodall, R. O., Watson, R. L., and Irgolic, K. J.,

J. Chem. Phys. 64, 1210 (1976) BaSa84 Baba, Y., Sasaki, T. A.,

Surf. Interface Anal. 6, 171 (1984) BaSt75 Barrie, A., and Street, F. J., J. Electron Spectrosc. Relat. Phenom. 7, 1 (1977) BaWa77 Bahl, M. K., and Watson, R. L.,

J. Electron Spectrosc. Relat. Phenom. 10, 111 (1977) Bahl75 Bahl, M. K.,

J. Phys. Chem. Solids 36, 485 (1975) Barr83 Barr, T. L. Appl. Surf. Sci. 15, 1 (1983) BeFI80 Bertrand, P. A., and Fleischauer, P. D.

J. Vac. Sci. Technol. 17, 1309 (1980)

39
CHARLES D. WAGNER

BeMc85 Beers, W. W., McCarley, R. E., Inorg. Chem. 24, 472 (1985) BeWa79 Best, S. A., Walton, R. A.

Inorg. Chem. 18, 486 (1979)

Berts 1 Bertrand, P. A.

J. Vac. Sci. Technol. 18, 28 (1981)

BiPo73 Biloen, P., Pott, G. T.,

J. Catal. 30, 169 (1973) BiSwSO Bird, R. J., and Swift, P.,

J. Electron Spectrosc. Relat. Phenom. 21, 227 (1980) Bind73+ Binder, H., Z. Naturforsch. B 28, 256 (1973) BrFe76+ Brant, P., Feltham, R. D.,

J. Organometal. Chem. 120, C53 (1976) BrFe80+ Brant, P., Feltham, R. D., Inorg. Chem. 19, 2673 (1980) BrFe83 + Brant, P., Feltham, R. D.,

J. Electron Spectrosc. Relat. Phenom. 32, 205 (1983) BrFr74 Brand, P., and Freiser, H., Anal. Chem. 46, 1147 (1974) BrMc72 Brinen, J. S., McClure, J. E., Anal. Lett. 5, 737 (1972) BrWh78 Brainard, W. A., and Wheeler, D. R.

J. Vac. Sci. Technol. 15, 1801 (1978)

Brio80 Brion, D., Appl. Surf. Sci. 5, 133 (1980) BuBu74 + Burger, K., Buvari, A., Inorg. Chim. Acta 11, 25 (1974) BuSw82 Burns, F. C, Swalen, J. D.,

J. Phys. Chem. 86, 5123 (1982) Burk79 Burkstrand, J. M.

J. Vac. Sci. Technol. 16, 363 (1979) CAB 71 + Clark, D. T., Adams, D. B., and Briggs, D.,

J. Chem. Soc. Chem. Commun. 1971, 603 CBA 73 + Clark, D. T., Briggs, D., and Adams, D. B.,

J. Chem. Soc. Dalton Trans. 1973, 169 CBR 76 Chuang, T. J., Brundle, C. R., and Rice, D. W.,

Surf. Sci. 59, 413 (1976) CCC 73+ Cheng, K. L., Carver, J. C, and Carlson, T. A., Inorg. Chem. 12, 1702 (1973) CCHB81 Courteix, D., Chayrouse, J., Heintz, L., Baptist, R., Solid State Commun. 39, 209 (1981) CCT 83 Chuang, T. J., Coufal, H., and Traeger, F.,

J. Vac. Sci. Technol. A 1, 1236 (1983) CDGV80 Cimino, A., De Angelis, B. A., Gazzoli, D., Valigi, M.,

Z. Anorg. Allg. Chem. 460, 86 (1980) CDH 74 + Connor, J. A., Derrick, L. M. R., and Hillier, I. H.,

J. Chem. Soc. Faraday Trans. II 70, 941 (1974) CDN 77 Carlson, T. A., Dress, W. B., and Nyberg, G. L., Phys. Scr. 16, 211 (1977)

40
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

CEHL75 + Chatt, J., Elson, C. M., Hooper, N. E., Leigh, G. J.,

J. Chem. Soc. Dalton Trans. 1975, 2392 CELC76+ Chatt, J., Elson, C. M., Leigh, G. J., Connor, J. A.,

J. Chem. Soc. Dalton Trans. 1976, 1352 CFKM73 Clark, D. T., Feast, W. J., Kilcast, D., Musgrave, W. K. R.,

J. Polym. Sci. Polym. Chem. Ed. 11, 389 (1973) CFRS80 Clark, D. T., Fok, T., Roberts, G. G., Sykes, R. W., Thin Solid Films 70, 261 (1980) CFTT80 Clark, D. T., Feast, W. J., Tweedale, P. J., Thomas, H. R.,

J. Polym. Sci. Polym. Chem. Ed. 18, 1651 (1980) CGR 78 Colton, R. J., Guzman, A. M., and Rabalais, J. W.,

J. Appl. Phys. 49, 409 (1978) CHW 76 Castle, J. E., Hazell, L. B., and Whitehead, R. D.,

J. Electron Spectrosc. Relat. Phenom. 9, 247 (1976) CHW 79 Castle, J. E., Hazell, L. B., and West, R. H.,

J. Electron Spectrosc. Relat. Phenom. 16, 97 (1979) CKAM72+ Clark, D. T., Kilcast, D., Adams, D. B., Musgrave, W. K. R.,

J. Electron Spectrosc. Relat. Phenom. 1, 232 (1972) CKAM75 + Clark, D. T., Kilcast, D., Adams, D. B., Musgrave, W. K. R.

J. Electron Spectrosc. Relat. Phenom. 6, 117 (1975) CKLN78 Copperthwaite, R. G., Kunze, O. A., Lloyd, J., Neely, J. A., Tuma, W.,

Z. Naturforsch. 33A, 523 (1978) CKM 71 Clark, D. T., Kilcast, D., and Musgrave, W. K. R.,

J. Chem. Soc. Chem. Commun. 1971, 517 CLSW83 Christie, A. B., Lee, J., Sutherland, I., and Walls, J. M., Appl. Surf. Sci. 15, 224(1983)

CMHL77 Contour, J. P., Mouvier, G., Hoogewijs, M., Leclere, C,

J. Catal. 48, 217 (1977) CSC 72 Carver, J. C, Schweitzer, G. K., and Carlson, T. A.,

J. Chem. Phys. 57, 973 (1972) CWH 82+ Carvalho, M., Wieserman, L. F., and Hercules, D. M., Appl. Spectrosc. 36, 290 (1982) CWRG72 Cohen, R. L., Wertheim, G. K., Rosencwaig, A., Guggenheim, H. J., Phys. Rev. B 5, 1037 (1972) CWRL77+ Clark, D. T., Woolsey, L S., Robinson, S. D., Laing, K. R., Wingfield, J. N., Inorg. Chem. 16, 1201 (1977) CaLe73 Cahen, D., Lester, J. E., Chem. Phys. Lett. 18, 109 (1973) CaRo78 Carley, A. F., Roberts, M. W.

Proc. R. Soc. London Ser. A 363, 403 (1978) CaWe79 Castle, J. E., and West, R. H.,

J. Electron Spectrosc. Relat. Phenom. 16, 195 (1979) CaWc80 Castle, J. E., and West, R. H.,

J. Electron Spectrosc. Relat. Phenom. 18, 355 (1980) ChGr72 Chadwick, D., Graham, J. Nature (london) Phys. Sci. 237, 127 (1972) ChHa79 Chadwick, D., Hashemi, T., Surf. Sci. 89, 649 (1979) Chad73 Chadwick, D. Chem. Phys. Lett. 21, 293 (1973)

41
CHARLES D. WAGNER

CiDe7S Cimino, A., De Angelis, B. A.,

J. Catal. 36, 11 (1975) CiHa74 Citrin, P. H., Hamann, D. R., Phys. Rev. B 10, 4948 (1974)

Citr73 Citrin, P. H., Phys. Rev. B 8, 8 (1973) ClAd71 Clark, D. T., Adams, I.,

J. Chem. Soc. Chem. Commun. 1971, 741

CIRi76 Clarke, T. A., Rizkalia, E. N., Chem. Phys. Lett. 37, 523 (1976) CITh76+ Clark, D. T., Thomas, H. R.,

J. Polym. Sci. Polym. Chem. Ed. 14, 1701 (1976) CITh78 Clark, D. T., Thomas, H. R.,

J. Polym. Sci. Polym. Chem. Ed. 16, 791 (1978) CoHe72 Cox, L. E., Hercules, D. M.,

J. Electron Spectrosc. Relat. Phenom. 1, 193 (1972) CoMa83 Corbett, J. D., Marek, H. S., Inorg. Chem. 22, 3194 (1983) CoRa76 Colton, R. J., Rabalais, J. W.,

Inorg. Chem. 15, 237 (1976) Conn78 Conner, G. R.,

J. Vac. Sci. Technol. 15, 343 (1978) DAEC79 Dolle, P., AInot, M., Ehrhardt, J. J., Cassuto, A.,

J. Electron Spectrosc. Relat. Phenom. 17, 299 (1979) DHKB80 Dennis, A. M., Howard, R. A., Kadish, K. M., Bean, J. L., Brace, J., Winograd, N., Inorg. Chim. Acta 44, L139 (1980) DKMB76 Dufour, G., Kamatak, R. D., Mariot, J. -M., Bonnelle, C,

Chem. Phys. Lett. 42, 433 (1976) DML 84 Datta, M., Mathieu, H. J., and Landolt, D., Appl. Surf. Sci. 18, 299 (1984) DMNK76 Dufour, G., Mariot, J. M., Nilsson-Jatko, P. E., and Kamatak, R. C,

Phys. Scr. 13, 370 (1976) DPS 76 Dickinson, T., Povey, A. F., and Sherwood, P. M. A.,

J. Chem. Soc. Faraday Trans. I 72, 686 (1976) DPS 77 Dickinson, T., Povey, A. F., and Sherwood, P. M. A., , J. Chem. Soc. Faraday Trans. I 73, 332 (1977) DSBG82 Dharmadhikari, V. S., Sainkar, S. R., Badrinarayan, S., Goswami, A.,

J. Electron Spectrosc. Relat. Phenom. 25, 181 (1982) Dale76 Dale, A. J., Phosphorus 6, 81 (1976) DeRa77 Debies, T. P., Rabalais, J. W., Chem. Phys. 20, 277 (1977) DcRo84 Derry, G. N., Ross, P. N., Solid State Commun. 52, 151 (1984)

DiCISl + Dilks, A., Clark, D. T.,

J. Polym. Sci. Polym. Chem. Ed. 19, 2847 (1981) DiTa74+ Dillard, J. G., Taylor, L. T.,

J. Electron Spectrosc. Relat. Phenom. 3, 455 (1974

Dilk81 Dilks, A.,

J. Polym. Sci. Polym. Chem. Ed. 19, 1319 (1981)

42
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

EHKT80 ErtI, G., Hier!, R., Knozinger, H., Thiele, N., Urbach, H. P., Appl. Surf. Sci. 5, 49 (1980) EMGK74 + Escard, J., Mavel, G., Guerchais, J. E., Kergoat, R., Inorg. Chem. 13, 695 (1974) EPC 75 Escard, J., Pontvianne, B., and Contour, J. P.,

J. Electron Spectrosc. Relat. Phenom. 6, 17 (1975) EPCC75 Escard, J., Pontvianne, B., Chenebaux, M. T., Cosyns, J., Bull. Soc. Chim. Fr. 1975, 2400 EUMW80+ Edwards, D. A., Uden, G., Mialki, W. S., Walton, R. A., Inorg. Chim. Acta 40, 25 (1980) EbSi79 Ebbinghaus, G., Simon, A., Chem. Phys. 43, 117 (1979) EbWa75 + Ebner, J. R., Walton, R. A., Inorg. Chem. 14, 2289 (1975) EgPa84 Egert, B., Panzner, G., Phys. Rev. B 29, 2091 (1984) ErWa75 Ertl, G., Wandelt, K., Surf. Sci. 50, 479 (1975) EvRc81 Everhart, D. S., and Reillcy, C. N.

Surf. Interface Anal. 3, 258 (1981) Evan85 Evans, S., Surf. Interface Anal. 7, 299 (1985) FBWF74 Fuggle, J. C, Burr, A. F., Watson, L. M., Fabian, D. J., Lang, W.,

J. Phys. F. 4, 335 (1974) FCFG77 Fontaine, R., Caillat, R., Feve, L., Guittet, M. J., *

J. Electron Spectrosc. Relat. Phenom. 10, 349 (1977) FEMY77 Fisher, G. B., Erikson, N. E., Madey, T. E., Yates, J. T., Surf. Sci. 65, 210 (1977) FHPW73 Friedman, R. M., Hudis, J., Perlman, M. L., Watson, R. E., Phys. Rev. B 8, 2434 (1973) FHR 80 Fukuda, Y., Honda, F., and Rabalais, J. W.,

Surf. Sci. 93, 335 (1980) FHT 77+ Freeland, B. H., Habeeb, J. J., and Tuck, D. G., Can. J. Chem. 55, 1528 (1977) FHV 75 Fiermans, L., Hoogewijs, R., and Vennik, J., Surf. Sci. 63, 390 (1975) FKWF77 Fuggle, J. C, Kallne, E., Watson, L. M., and Fabian, D. J., Phys. Rev. B 16, 750 (1977) FMI 74+ Frost, D. C, McDowell, C. A., and Ishitani, A., Mol. Phys. 27, 1473 (1974) FMPB83 Furlani, C, Mattogno, G., Polzonetti, G., Braca, G., Valentini, G., Inorg. Chem. Acta 69, 199 (1983) FMSM75 Fuggle, J. C, Madey, T. E., Steinkilberg, M., Menzel, D.,

Surf. Sci. 52, 521 (1975) FMW 72 Frost, D. S., McDowell, C. A., and Woolsey, I. S., Chem. Phys. Lett. 17, 320 (1972) FPPT83+ Furlani, C, Polzonetti, G., Preti, C, Tosi, G.,

Inorg. Chim. Acta 73, 105 (1983) FSJL83+ Folkesson, B., Sundberg, P., Johansson, L., Larsson, R.,

J. Electron Spectrosc. Relat. Phenom. 32, 248 (1983)

43
CHARLES D. WAGNER

FSL 85 Fierro, J. L. G., Salazar, E., and Legarreta, J. A.,

Surf. Interface Anal. 7, 97 (1985) FSM 82 Fellenberg, R., Streubel, P., and Meisel, A., Phys. Status Solid! (B) 112, 55 (1982) FUMT76 Franzen, H. F., Umana, M. X., McCreaiy, J. R., Thorn, R. J., J. Solid State Chem. 18, 363 (1976) FWFA75 Fuggle, J. C, Watson, L. M., Fabian, D. J., and Affrossman, S.,

J. Phys. F. 5, 375 (1975) FWUM79+ Fischer, A. B., Wrighton, M. S., Umana, M., Murray, R. W.,

J. Am. Chem. Soc. 101, 3442 (1979) FaBa79+ Fahey, D. R., Baldwin, B. A., Inorg. Chim. Acta 36, 269 (1979) FaGo77 Fan, J. C. C, Goodenough, J. B.,

J. Appl. Phys. 48, 3524 (1977) FiJo72+ Finn, P., Jolly, W. L., Inorg. Chem. 11, 1435 (1972) FlMa82 Fleisch, T. H., and Mains, G. J., Appl. Surf. Sci. 10, 51 (1982) FlMa82a Fleisch, T. H., Mains, G. J.,

J. Chem. Phys. 76, 780 (1982) FIWe75 + Fluck, E., Weber, D., Z Anorg. Allg. Chem. 412, 47 (1975) FoLa82+ Folkesson, B., Larsson, R.,

J. Electron Spectrosc. Relat. Phenom. 26, 157 (1982) FoIk73+ Folkesson, B., Acta Chem. Scand. 27, 287 (1973) FrSa75 Franzen, H. F., Sawatzky, G.,

J. Solid State Chem. 15, 229 (1975) FuOs84 Fujimori, A., Osterwalder, J.,

J. Phys. C. 17, 2869 (1984) FuSc84 Fujimori, A., Schlapbach, L.,

J. Phys. C. 17, 341 (1984) Fugg77 Fuggle, J. C,

Surf. Sci. 69, 581 (1977) GBMP79+ Grimblot, J., Bonnelle, J. P., Mortreux, A., Petit, F., Inorg. Chim. Acta 34, 29 (1979) GBP 81 Garbassi, F., Bart, J. C. J., and Petrini, G.,

J. Electron Spectrosc. Relat. Phenom. 22, 95 (1981) GCH 76+ Gray, R. C, Carver, J. C, and Hercules, D. M.,

J. Electron Spectrosc. Relat. Phenom. 8, 343 (1976) GFWA77 Gimzewski, J. K., Fabian, D. J., Watson, L. M., Affrossman, S.,

J. Phys. F. 7, L305 (1977) GGM 80 Grunthaner, P. J., Grunthaner, F. J., and Mayer, J. W.,

J. Vac. Sci. Technol. 17, 924 (1980) GGM 82 Grunthaner, P. J., Grunthaner, F. J., and Madhukar, A.

J. Vac. Sci. Technol. 20, 680 (1982) GHSS80 Gorlich, E., Haber, J., Stoch, A., Stoch, J.,

J. Solid State Chem. 33, 121 (1980) J3Mb 79 Gresch, R., Mueller-Warmuth, W., and Dutz, H.

J. Non-Cryst. Solids 34, 127 (1979)

44
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

GMS 74 +

GPDG79

GSM 75

GSMJ74

GZF73 +

GaWi77

GlWa79 +

GrHe77 +

GrMa75 +

HAS 75

HAS 76

HBBF77

HCMS74

HFBZ82

HFS82

HFV77

HGW75

HHDD81

HHJ69 +

HHJ70 +

HHL70

HJGN70

HKNU78

HLHM79

HMUZ78

Grim, S. O., Matienzo, L. J., and Swartz, W. E., Inorg. Chem. 13, 447 (1974)

Gajardo, P., Pirotte, D., Defosse, C, Grange, P., Delmon, B.,

J. Electron Spectrosc. Relat. Phenom. 17, 121 (1979)

Ginnard, C. R., Swingle, R. S., and Monroe, B. M.,

J. Electron Spectrosc. Relat. Phenom. 6, 77 (1975) Groenenboom, C. J., Sawatzky, G., Meijer, H. J. D., Jellinek, P.,

J. Organometal. Chem. 76, C4 (1974)

Grutsch, P. A., Zeller, M. V., and Fehlner, T. P., Inorg. Chem. 12, 1432 (1973) Gaarenstroom, S. W., and Winograd, N.,

J. Chem. Phys. 67, 3500 (1977)

Glicksman, H. D., Walton, R. A., Inorg. Chim. Acta 33, 255 (1979)

Gray, R. C, Hercules, D. M.,

Inorg. Chem. 16, 1426 (1977) Grim, S. O., Matienzo, L. J., Inorg. Chem. 14, 1014 (1975)

Haider, H. C, Alonso, J., and Swartz, W. E., Z. Naturforsch A 30, 1485 (1975)

Haider, H. C, Alonso, J., and Swartz, W. E., Phys. Rev. B 13, 2418 (1976) Hagstrom, S. B. M., Bachrach, R. Z., Bauer, R. S., Flodstrom, S. A., Phys. Scr. 16, 414 (1977)

Hillig, H., Cleff, B., Mehlhom, W., Schmitz, W.,

Z. Physik 268, 225 (1974)

Hillebrecht, F. U., Fuggle, J. C, Bennett, P. A., Zolnierek, Z.

Phys. Rev. B 27, 2179 (1982)

Henry, R. M., Fryberger, T. A. B., and Stair, P. C,

J. Vac. Sci. Technol. 20, 818 (1982)

Hoogewijs, R., Fiermans, L., and Vennik, J.,

J. Electron Spectrosc. Relat. Phenom. 11, 171 (1977) Hammond, J. S., Gaarenstroom, S. W., and N. Winograd

Anal. Chem. 47, 2194 (1975) Hammond, J. S., Holubka, J. W., Devries, J. E., Duckie, R. A., Corros. Sci. 21, 239 (1981)

Hendrickson, D. N., Hollander, J. M., and Jolly, W. L., Inorg. Chem. 8, 2642 (1969)

Hendrickson, D. N., Hollander, J. M., and Jolly, W. L. Inorg. Chem. 9, 612 (1970) Hagstrom, S. B. M., Heden, P. O., and Lofgren, H., Solid State Commun. 8, 1245 (1970) Hamrin, K., Johansson, G., Gelius, U., Nordling, C, Siegbahn, K., Phys. Scr. 1, 277 (1970) Haycock, D. E., Kasrai, M., Nicholls, C. J., Urch, D. S., J. Chem. Soc. Dalton Trans. 1978, 1791

Hilaire, L., Legare, P., Holl, Y., and Maire, G., Solid State Commun. 32, 157 (1979)

Haber, J., Machej, T., Ungier, L., and Ziolkowski, J.,

J. Solid State Chem. 25, 207 (1978)

45
CHARLES D. WAGNER

HNUW78 Haycock, D. E., Nicholls, C. J., Urch, D. S., Webber, M. J., Wiech, G.,

J. Chem. Soc. Dalton Trans. 1978, 1785 HSBS81 Hegde, R. I., Sainkar, S. R., Badrinarayanan, S., Sinha, A. P. B.,

J. Electron Spectrosc. Relat. Phenom. 24, 19 (1981) HSGH81 + Horvath, B., Strutz, J., Geyer-Lippmann, J., Horvath, E. G., Z. Anorg. Allg. Chem. 483, 181 (1981) HSPB78 Hsu, S. L., Signorelli, A. J., Pey, G. P., Baughman, R. H.,

J. Chem. Phys. 69, 106 (1978) HSU 76+ Haber, J., Stoch, J., and Ungier, L.,

J. Electron Spectrosc. Reiat. Phenom. 9, 459 (1976) HTW 73+ Hoof, D. L., Tisley, D. G., and Walton, R. A.,

J. Chem. Soc. Dalton Trans. 1973, 201 HTW 74+ Hamer, A. D., Tisley. D. G., and Walton, R. A.,

J. Inorg. Nucl. Chem. 36, 1771 (1974) HUGH79 Haycock, D., Urch, D. S., Garner, C. D., Hillier, I. H.,

J. Electron Spectrosc. Relat. Phenom. 17, 345 (1979) HW 79 Hoste, S., Van De Vondel, D. F., and Van Der Kelen, G. P.,

J. Electron Spectrosc. Relat. Phenom. 17, 191 (1979) HWW74 Hoste, S., Wilieman, H., Van De Vondel, D., Van Dcr Kelcn, G. P.,

J. Electron Spectrosc. Relat. Phenom. 5, 227 (1974) HWW 75 Hufner, S., Wertheim, G. K., and Wemick, J. H., Solid State Commun. 17, 417 (1975) HaSh73+ Harker, H., Sherwood, P. M. A.,

Phil. Mag. 27, 1241 (1973) HaUn77 Haber, J., and Ungier, L,

J. Electron Spectrosc. Relat. Phenom. 12, 305 (1977) HaWa74 + Hamer, A. D., Walton, R. A., Inorg. Chem. 13, 1446 (1974) HaWi77 Hammond, J. S., Winograd, N.,

J. Electrochem. Electroanal. Chem. 78, 55 (1977) HeMaSO Hedman, J., and Martensson, N., Phys. Scr. 22, 176 (1980) HcSi83 Hegde, R. I., Sinha, A. P. B., Surf. Sci. 133, 233 (1983) HcWi80 Hewitt, R. W., Winograd, N.,

J. Appl. Phys. 51, 2620 (1980) Hegd82 Hegde, R. I., Surf. Interface Anal. 4, 205 (1982) HoTh79 Howng, W. Y., Thorn, R. J., Chem. Phys. Lett. 62, 57 (1979) HoTh80 Howng, W. Y., Thorn, R. J.,

J. Chem. Phys. Solids 41, 75 (1980)

H0II8I Hollinger, G., Appl. Surf. Sci. 8, 318 (1981) HuBa74 Hughes, W. B., Baldwin, B. A., Inorg. Chem. 13, 1531 (1974) HuRaSl Hu, H. -K., Rabalais, J. W.,

Surf. Sci. lo7, 376 (1981) IIKK76 Ikemoto, I., Ishii, K., Kinoshita, S., Kuroda, H., Franco, M. A. A., Thomas, J. M. J., Solid State Chem. 17, 425 (1976)

46

4
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

IKIM73

IKYK82 +

IMNN79

ITI82

InYaSl

IwOg79

JHBK73

JJH80

JWHD84

JoBe75

JoHeSO

KAKM78

KBAM72

KBAW74

KDR77

KEML74

KGW74

KGW76

KISC80

KKL83

KLMP73

KLMP74

KMH78

KMI81

KNPP74

Ihara, H., Kumashiro, Y., Itoh, A., Maeda, K., Jpn. J. Appl. Phys. 12, 1462 (1973)

Ikemoto, I., KJkuchi, K., Yakushi, K., Kuroda, H., Solid State Commun. 42, 257 (1982)

Iwasaki, H., Mizokawa, Y., Nishitani, R., Nakamura, S., Surf. Sci. 86, 811 (1979)

Iwakuro, H., Tatsuyama, C, and Ichimura, S., Jpn. J. Appl. Phys. 21, 94 (1982)

Inoue, Y., Yasumori, I., Bull. Chem. Soc. Jpn. 54, 1505 (1981)

Iwasawa, Y., Ogasawara, S.,

J. Chem. Soc. Faraday Trans. I 75, 1465 (1979)

Johansson, G., Hedman, J., Bemdtsson, A., Klasson, M., and Nilsson, R.,

J. Electron Spectrosc. Relat. Phenom. 2, 295 (1973)

Joyner, D. J., Johnson, O., and Hercules, D. M.,

J. Am. Chem. Soc. 102, 1910 (1980)

Jennison, D. R., Weightman, P., Hannah, P., Davies, M.,

J. Phys. C. 17, 3701 (1984)

Jorgenson, C. K., and Berthou, H., Chem. Phys. Lett. 36, 432 (1975)

Joyner, D. J., Hercules, D. M.,

J. Chem. Phys. 72, 1095 (1980)

Kowalczyk, S. P., Apai, G., Kaindl, G., McFeely, F. R., Ley, K., Shirley, D. A., Solid State Commun. 25, 847 (1978) Kumar, G., Blackburn, J. R., Albridge, R. G., Moddeman, W. E., Jones, M. M.,

Inorg. Chem. 11, 296 (1972) Kim, K. S., Baitinger, W. E., Amy, J. W., Winograd, N.,

J. Electron Spectrosc. Relat. Phenom. 5, 351 (1974)

Krishnan, N. G., Delgass, W. N., and Robertson, W. D.,

J. Phys. F. 7, 2623 (1977)

Kowalczyk, S. P., Edelstein, N., McFeely, F. R., Ley, L., Shirley, D. A., Chem. Phys. Lett. 29, 491 (1974) Kim, K. S., Gossmann, A. F., and Winograd, N., Anal. Chem. 46, 197 (1974) Kim, K. S., Gaarenstroom, S. W., and Winograd, N., Chem. Phys. Lett. 41, 503 (1976)

Kazmerski, L. L., Ireland, P. J. . Sheldon, P., Chu, T. L., Chu, S. S., and Lin, C. L. J., Vac. Sci. Technol. 17, 1061 (1980)

Kasperkiewicz, J., Kovacich, J. A., and Lichtman, D.,

J. Electron Spectrosc. Relat. Phenom. 32, 128 (1983)

Kowalczyk, S. P., Ley, L., McFeely, F. R., Pollak, R. A., and Shirley, D. A., Phys. Rev. B 8, 3583 (1973)

Kowalczyk, S. P., Ley, L., McFeely, F. R., Pollak, R. A., and Shirley, D. A., Phys. Rev. B 9, 381 (1974)

Kerkhof, F. P. J., Moulijn, J. A., and Heeres, A.,

J. Electron Spectrosc. Relat. Phenom. 14, 453 (1978)

Kishi, K., Motoyoshi, Y., and Ikeda, S., Surf. Sci. 105, 313 (1981)

Kharitonova, L. C, Nefedov, V. L, Pankratova, L. N., Pershin, V. L., Zh. Neorg. Khim. 19, 860 (1974)

47
CHARLES D. WAGNER

KOAL82 Khumalo, F. S., Olson, C. G., Anderegg, J. W., Lynch, D. W., Chem. Phys. 65, 289 (1982) KOK 83 Kohiki, S., Ohmura, T., and Kusao, K.

J. Electron Spectrosc. Relat. Phenom. 31, 85 (1983) KOS 79 Kuroda, H., Ohta, T., and Sato, Y.,

J. Electron Spectrosc. Relat. Phenom. 15, 21 (1979) KOW 73 Kim, K. S., O'Leary, T. J., and Winograd, N.

Anal. Chem. 45, 2214 (1973) KPHB83 Klein, J. C, Proctor, A., Hercules, D. M., Black, J. R,

Anal. Chem. 55, 2055 (1983) KPLW80 Koel, B. E., Praline, G., Lee, H. L, White, J. M.,

J. Electron Spectrosc. Relat. Phenom. 21, 31 (1980) KPML73 Kowalczyk, S. P., PoUak, R. A., McFeely, F. R., Ley, L., and Shirley, D. A., Phys. Rev. B 8, 2387 (1973) KPSL83 Kcndelewicz, T., Petro, W. G., Silberman, J. A., Lindau, I., Spicer, W. E.,

J. Vac. Sci. Technol. B 1, 623 (1983) KPW 80+ Kouba, J. K., Pierce, J. L., and Walton, R. A.,

J. Organometal. Chem. 202, C105 (1980) KSPB76+ Kaplunov, M. G., Shulga, Y. M., Pokhodnya, K. I., Borodko, Y. G., Phys. Status Solidi 73, 336 (1976) KTWY76 Kinomura, F., Tamura, T., Watanabe, I., Yokoyama, Y., Ikeda, S., Bull. Chem. Soc. Jpn. 49, 3544 (1976) KWBF77 Kurmaev, E. Z., Werfel, F., Brummer, O., Fluekiger, R., Solid State Commun. 22, 375 (1977) KWD 71 Kim, K. S., Winograd, N., and Davis, R. E.,

J. Am. Chem. Soc. 93, 6296 (1971) KaE179 Katrib, A., El-Egaby, M. S., Inorg. Chim. Acta 36, L405 (1979) KaUr79 Kasrai, M., Urch, D. S.,

J. Chem. Soc. Faraday Trans. II 75, 1522 (1979) KaWi76+ Karweik, D. H., Winograd, N., Inorg. Chem. 15, 2336 (1976) KeK176 Keiser, J., Kleber, R, Appl. Phys. 9, 315 (1976) Kilk73+ Kishi, K., Ikeda, S. Bull. Chem. Soc. Jpn. 46, 341 (1973)

Kilk74 Kishi, K., Ikeda, S.,

J. Phys. Chem. 78, 107 (1974) KiWi73 Kim, K. S., Winograd, N., Chem. Phys. Lett. 19, 209 (1973) KiWi74 Kim, K. S., Winograd, N.,

J. Catal. 35, 66 (1974) KiWi74a Kim, K. S., Winograd, N.,

Surf. Sci. 43, 625 (1974) KiWi75+ Kim, K. S., Winograd, N., Chem. Phys. Lett. 30, 91 (1975) Kim 75 Kim, K. S., Phys. Rev. B 11, 2177 (1975) KlHc83 Klein, J. C, Hercules, D. M.,

J. Catal. 82, 424 (1983)

48
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

KoGr85 Koenig, M. F., Grant, J. T., Appl. Surf. Sci. 20, 481 (1985) KoNa80 Konno, H., Nagayama, M.,

J. Electron Spectrosc. Relat. Phenom. 18, 341 (1980) LAK 77 Lin, A. W. C, Armstrong, N. R., and Kuwana, T., Anal. Chem. 49, 1228 (1977) LANM81 Lebugle, A., Axelsson, U., Nyholm, R., and Martensson, N.

Phys. Scr. 23, 825 (1981) LBHK73 Leonhardt, G., Berndtsson, A., Hedman, J., Klasson, M., Nilsson, R., Phys. Status Solidi (B) 60, 241 (1973) LBNN78 + Lindberg, B., Berndtsson, A., Nilsson, R., Nyholm, R., Exner, O., Acta Chem. Scand. A 32, 353 (1978) LDDB80 Lerebours, B., Duerr, J., D'huisser, A., Bonnelle, J. P., Leuglet, M.,

Phys. Status Solidi (A) 61, K175 (1980) LFBC80 Lasser, R., Fuggle, J. C, Beyss, M., Campagna, M., Steglich, F., Hulliger, F., Physica 102b, 360 (1980) LFS 73 + Larsson, R., Folkesson, B., and Schoen, G., Chem. Scr. 3, 88 (1973) LFWS79 Lorenz, P., Finster, J., Wcndt, G., Salyn, J. V., Zumadilov, E. K., Nefcdov, V. I. J. Electron Spectrosc. Relat. Phenom. 16, 267 (1979) LKMP73 Ley, L., Kowalczyk, S. P., McFeely, F. R., Pollak, R. A., Shirley, D. A., Phys. Rev. B 8, 2392 (1973) LMF 80 Larsson, R., Malek, A., and Folkesson, B., Chem. Scr. 16, 47 (1980) LMKJ75 Ley, L., McFeely, F. R., Kowalczyk, S. P., Jenkin, J. G., and Shirley, D. A., Phys. Rev. B 11, 600 (1975) LPGC77 Lindau, L, Pianetta, P., Garner, C. M., Chye, P. E., Gregory, P. E., Spicer, W. E., Surf. Sci. 63, 45 (1977) LPKS72 Ley, L., Pollak, R., Kowalczyk, S., Shirley, D. A., Phys. Letters 41A, 429 (1972) LPMK74 Ley, L., Pollak, R. A., McFccIy, F. R., Kowalczyk, S. P., Shirley, D. A., Phys. Rev. B 9, 600 (1974) LPWF75 Lang, W. C, Padalia, B. D., Watson, L. M., Fabian, D. J.,

J. Electron Spectrosc. Relat. Phenom. 7, 357 (1975) LPWF76 Lang, W., Padalia, B., Watson, L., Fabian, D., Norris, P., Discuss. Faraday Soc. 60, 36 (1976) LPYS76 Lindau, L, Pianetta, P., Yu, K. Y., Spicer, W. E., Phys. Rev. B 16, 492 (1976) LRLH82 Lampert, W. V., Rachocki, K. D., Lamartine, B. C, Haas, T. W.,

J. Electron Spectrosc. Relat. Phenom. 26, 133 (1982) LRSW73 Lindsay, J. R., Rose, H. J., Swartz, W. E., Watts, P. H., Rayburn, K. A., Appl. Spectrosc. 27, 1 (1973) LaFo76 Larsson, R., Folkesson, B., Chem. Scr. 9, 148 (1976) LaHa81 Larson, D. T., Haschke, J. M.,

Inorg. Chem. 20, 1945 (1981) LaKc76 Lavielle, L., Kessler, H.,

J. Electron Spectrosc. Relat. Phenom. 8, 95 (1976) LaLu79 Larkins, F. P., and Lubenfeld, A.

J. Electron Spectrosc. Relat. Phenom. 15, 137 (1979)

49
CHARLES D. WAGNER

LaMa84 Landis, W. J., Martin, J. R.,

J. Vac. Sci. Technol. A 2, 1108 (1984) LaRo84 Latta, E. E., Ronay, M.,

Phys. Rev. Lett. 53, 948 (1984) LaVc70 Langer, D. W., and Vesely, C. J., Phys. Rev. B 2, 4885 (1970)

Lars74 Larson, P.,

J. Electron Spectrosc. Relat. Phenom. 4, 213 (1974) LeBr72+ Leigh, G. J., Bremser, W.,

J. Chem. See. Dalton Trans. 1972, 1217 LeRa77 Lee, T. H., Rabaiais, J. W.,

J. Electron Spectrosc. Relat. Phenom. 11, 123 (1977) LiHe75 + Lindberg, B. J., Hedman, J., Chem. Scr. 7, 155 (1975) LlMa79+ Llopiz, P., Maire, J. -C,

Bull. Soc. Chim. Fr. 1979, 457 MBDS84 Mandale, A. B., Badrinarayanan, S., Date, S. K., Sinha, A. P. B.,

J. Electron Spectrosc. Relat. Phenom. 33, 61 (1984) MBN 80 Martensson, N., Berndtsson, A., and Nyholm, R.,

J. Electron Spectrosc. Relat. Phenom. 19, 299 (1980) MCSS82 McLean, W., Colmenares, C. A., Smith, R. L., Somorjai, G. A.

Phys. Rev. B 25, 8 (1982) MCSS83 McLean, W., Colmenares, C. A., Smith, R. L., Somorjai, G. A.,

J. Phys. Chem. 87, 788 (1983) MECC73 + Mavel, G., Escard, J., Costa, P., Castaing, J., Surf. Sci. 35, 109 (1973) MFA 85 Myers, C. E., Franzen, H. F., and Anderegg, J. W.,

Inorg. Chem. 24, 1822 (1985) MHD 81 Mariot, J-M., Hague, C. F., and Dufour, G., Phys. Rev. B 3164 (1981) MIN 81 Mizokawa, Y., Iwasaki, H., and Nakamura, S., Jpn. J. Appl. Phys. 20, L491 (1981) MINN78 Mizokawa, Y., Iwasaki, H., Nishitani, R., and Nakamura, S.,

J. Electron Spectrosc. Relat. Phenom. 14, 129 (1978) MKLP73 McFeely, F. R., Kowalczyk, S. P., Ley, L., Pollak, R. A., Shirley, D. A., Phys. Rev. B 7, 5228 (1973) MMRC72+ Mason, R., Mingos, D. M. P., Rucci, G., Connor, J. A.,

J. Chem. Soc. Dalton Trans. 1972, 1730 MNTB70 Malmsten, G., Nilsson, O., Thoren, I., Bergmark, J. E., Phys. Scr. 1, 37 (1970) MRV 82 Martensson, N., Reihl, B., and Vogt, O., Phys. Rev. B 25, 824 (1982) MRV 83 Mousty-Desbuquoit, C, Riga, J., and Verbist, J. J.,

J. Chem. Phys. 79, 26 (1983) MSAV7H- Morgan, W. E., Stec, W. J., Albridge, R. G., Van Wazer, J. R., Inorg. Chem. 10, 926 (1971) MSC 73 McGuire, G. E., Schweitzer, G. Kk., and Carlson, T. A., Inorg. Chem. 12, 2451 (1973) MSG 72 Matienzo, L. J., Swartz, W. E., and Grim, S. O., Inorg. Nucl. Chem. Lett. 8, 1087 (1972)

50
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

MSSS81 Mclntyre, N. S., Sunder, S., Shoesmith, D. W., and Stanchell, F. W.,

J. Vac. Sci. Technol. 18, 714 (1981) MSV 73 Morgan, W. E., Stec, W. J., and Van Wazer, J. R., Inorg. Chem. 12, 953 (1973) MSV 79+ Maroie, S., Savy, M., and Verbist, J. J., Inorg. Chem. 18, 2560 (1979) MTHB71 + Malmsten, G., Thoren, I., Hogberg, S., Bergmark, J. E., Karlsson, S. E., Phys. Scr. 3, 96 (1971) MTT 84 + Miyake, I., Tanpo, T., and Tatsuyama, C,

Jpn. J. Appl. Phys. 23, 172 (1984) MVDN78 Mazalov, L. N., Volkov, B. B., Dvurechensky, S. Y., Nasonova, L. I., Zh. Neorg. Khim. 23, 1860 (1978) MVS 73 Morgan, W. E., Van Wazer, J. R., and Stec, W. J.,

J. Am. Chem. Soc. 95, 751 (1973) MWI 75 Murata, M., Wakino, K., and Ikeda, S.,

J. Electron Spectrosc. Relat. Phenom. 6, 459 (1975) MWM 77 McGilp, J. F., Weightman, P., and McGuire, E. J.,

J. Phys. C. 10, 3445 (1977) MYGS73 + Matienzo, L. J., Yin, L. I., Grim, S. O., Swartz, W. E., Inorg. Chem. 12, 2762 (1973) MaDu77 Mariot, J. M., and Dufour, G., Chem. Phys. Lett. 50, 219 (1977) MaDu78 Mariot, J. M., and Dufour, G.,

J. Electron Spectrosc. Relat. Phenom. 13, 403 (1978) MaWo75 + Matsuura, I., Wolfs, M. W. J.,

J. Catal. 37, 174 (1975) McCo75 Mclntyre, N. S. and Cook, M. G.

Anal. Chem. 47, 2208 (1975) McGi82 McEvoy, A. J., Gissler, W.,

Phys. Status Solidi (A) 69, K91 (1982) McTh76 McCreary, J. R., Thome, R. J.,

J. Electron Spectrosc. Relat. Phenom. 8, 425 (1976) McWe76 McGilp, J. F., Weightman, P.

J. Phys. C. 9, 3541 (1977) McZe77 Mclntyre, N. S., Zetaruk, D. G.

Anal. Chem. 49, 1521 (1977) MiLa73 + Mixan, C. E., Lambert, J. B.,

J. Org. Chem. 38, 1351 (1973) MiMi84 Mielczarski, J., Minni, E., Surf. Interface Anal. 6, 221 (1984) MoVa73 Morgan, W. E., Van Wazer, J. R.

J. Phys. Chem. 77, 96 (1973) MuTh80 Murch, G. E., Thorn, R. J.,

J. Phys. Chem. Solids 41, 785 (1980) NBK 74 Nefedov, V. I., Buslaev, Y. A., and Kokunov, Y. V., Zh. Neorg. Khim. 19, 1166 (1974) NBKY74 Nefedov, V. I., Buslaev, Kuznetsova, A. A., Yankina, L. F., Zh. Neorg. Khim. 19, 1416 (1974) NBM 80 Nyholm, R., Berndtsson, A., and Martensson, N.,

J. Phys. 13, L1091 (1980)

51
CHARLES D. WAGNER

NBM073 + Nefedov, V. I., Baranovskii, I. B., Molodkin, A. K., Omuralieva, V. O., Zh. Neorg. Khim. 18, 1295 (1973) NFM 81 Nakagaki, R., Frost, D. C, and McDowell, C. A.

J. Electron Spectrosc. Relat. Phenom. 22, 289 (1981) NFS 82+ Nefedov, V. I., Firsov, M. N., and Shaplygin, I. S.,

J. Electron Spectrosc. Relat. Phenom. 26, 65 (1982) NGDS75 Nefedov, V. I., Gati, D., Dzhurinskii, B. F., Sergushin, N. P., Salyn, Y. V., Zh. Neorg. Khim. 20, 2307 (1975) NIMN78 Nishitani, R., Iwasaki, H., Mizokawa, Y., Nakamura, S., Jpn. J. Appl. Phys. 17, 321 (1978) NIS 72 Nagakura, I., Ishii, T., and Sagawa, T.,

J. Phys. Soc. Japan 33, 758 (1972) NSBM80+ Nefedov, V. I., Salyn, Y. V., Baranovski, I. B., Majorova, A. G., Zh. Neorg. Khim. 25, 216 (1980) NSBN77+ Nefedov, V. I., Salyn, Y. V., Baronovskii, I. B., Nikolskii, A. B., Zh. Neorg. Khim. 22, 1715 (1977) NSCP74 Nefedov, V. I., Salyn, Y. V., Chertkov, A. A., Padurets, L. N., Zh. Neorg. Khim. 19, 1443 (1974) NSDU75 Nefedov, V. I., Salyn, Y. V., Domashevskaya, E. P., Ugai, Y. A., Terekhov, V. A.,

J. Electron Spectrosc. Relat. Phenom. 6, 231 (1975) NSK 79 Nefedov, V. I., Salyn, Y. V., and Keller, X., Zh. Neorg. Khim. 24, 2564 (1979) NSLS77 Nefedov, V. I., Salyn, Y. V., Leonhardt, G., Scheibe, R.,

J. Electron Spectrosc. Relat. Phenom. 10, 121 (1977) NSMN74 + Nefedov, V. I., Salyn, Y. V., Majorova, A. G., Nazarova, L. A., Baranovski, I. B., Zh. Neorg. Khim. 19, 1353 (1974) NSNN78+ Nakai, I., Sugitani, Y., Nagashima, K., Niwa, Y.,

J. Inorg. Nucl. Chcm. 40, 789 (1978) NSSK80+ Nefedov, V. I., Salyn, Y. V. Shtemenko, A. V., Kotelnikova, A. S., Inorg. Chim. Acta 45, L49 (1980) NSSP80 Nefedov, V. I., Salyn, Y. V., Solozhenkin, P. M., Pulatov, G. Y.

Surf. Interface Anal. 2, 171 (1980) NSWM80+ Nefedov, V. I., Salyn, Y. V., Walther, B., Messbauer, B., Schoeps, R., Inorg. Chim. Acta 45, L103 (1980) NSWU77+ Nefedov, V. I., Salin, J. V., Walther, D., Uhlig, E., Dinjus, E., Z. Chem. 17, 191 (1977) NZB 78+ Nefedov, V. I., Zhumadilov, E. K., and Baer, L., Zh. Neorg. Khim. 23, 2113 (1978) NZK 77 Nefedov, V. I., Zhumadilov, A. K., and Konitova, T. Y.,

J. Struct. Chem. Ussr 18, 692 (1977) NcBa72+ Nefedov, V. I., Baranovskii, I. B. Zh. Neorg. Khim. 17, 466 (1972) NcPo72+ Nefedov, V. I., Porai-Koshits, M. A., Mater. Res. Bull. 7, 1543 (1972) NeSa78 Nefedov., V. I., Salyn, Y. V., Inorg. Chim. Acta 28, L135 (1978) Nefe78+ Nefedov, V. I., Koord. Khim. 4, 1285 (1978) Ncfc82 Nefedov, V. I. J. Electron Spectrosc. Relat. Phenom. 25, 29 (1982)

52
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

NgHe74+ Ng, K. T., Hercules, D. M.,

J. Am. Chem. Soc. 97, 4169 (1974) NgHe76 Ng, K. T., Hercules, D. M.,

J. Phys. Chem. 80, 2095 (1976) NoGe72 Novakov, T., Geballe, T. H., Solid State Commun. 10, 225 (1972) NyMaSO Nyholm, R., and Martensson, N.

J. Phys. C. 13, L279 (1980) NyMaSl Nyholm, R., Martensson, N., Solid State Commun. 40, 311 (1981) OCH 79 Okamoto, Y., Carter, W. J., and Hercules, D. M., Appl. Spectrosc. 33, 287 (1979) OGB 80 Ohyoshi, A., Goetzfried, F., and Beck, W., Chem. Lett. 1980, 1537 OHDH81 Oscarson, D. W., Huang, P. M., Defosse, C, and Herbillon, A. Nature 291, 50 (1981) OHI 75+ Oku, M., Hirokawa, K., and Ikeda, S.,

J. Electron Spectrosc. Rclat. Phenom. 7, 465 (1975) OIIT79 Okamoto, Y., Ishida, N., Imanaka, T., Teranishi, S.,

J. Catal. 58, 82 (1979) OIT 80 Okomoto, Y., Imanaka, T., and Teranishi, S.,

J. Catal. 65, 448 (1980) OYK74+ Ohta, T., Yamada, M., and Kuroda, H.,

Bull. Chem. Soc. Jpn. 47, 1158 (1974) OkHi76 Oku, M., Hirokawa, K.,

J. Electron Spectrosc. Relat. Phenom. 8, 475 (1976) PADS78 Povey, A. F., Ansell, R. O., Dickinson, T., Sherwood, P. M. A.,

J. Electroanal. Chem. 87, 189 (1978) PCLH76 Patterson, T. A., Carver, J. C, Leyden, D. E., Hercules, D. M.,

J. Phys. Chem. 80, 1702 (1976) PEJ 82 Powell, C. J., Erickson, N. E., and Jach, T.,

J. Vac. Sci. Technol. 20, 625 (1981) PFD 73 Pignataro, S., Foffani, A., and Distefano, G., Chem. Phys. Lett. 20, 351 (1973) PHHJ70+ Pelavin, M., Hendrickson, D., Hollander, J., Jolly, W.,

J. Phys. Chem. 74, 1116 (1970) PHM 78+ Peeling, J., Hruska, F. E., Mclntyre, N. S., Can. J. Chem. 56, 1555 (1978) PHMC78+ Peeling, J., Hruska, F., McKinnon, D. M., Chauhan, M. S., Mclntyre, N. S. Can. J. Chem. 56, 2407 (1978) PJHK77 Platau, A., Johansson, L. L, Hagstrom, A. L., Karlsson, S. E., Hagstrom, S. B. M.,

Surf. Sci. 63, 153 (1977) PKHL80 Praline, G., Koel, B. E., Hance, R. L., Lee, H. I., White, J. M.,

J. Electron Spectrosc. Relat. Phenom. 21, 17 (1980) PKLJ73 Poole, R. T., Kemeny, P. C, Liesegang, J., Jenkins, J. G., Leckey, R. C. G.,

J. Phys. F. 3, L46 (1973) PKLS72 Pollak, R. A., Kowalczyk, S. P., Ley, L., Shirley, D. A., Phys. Rev. Lett. 29, 274 (1972) PLJL73 Poole, R. T., Leckey, R. C. G., Jenkin, J. G., Liesegang, J., Phys. Rev. B 8, 1401, (1973)

53
CHARLES D. WAGNER

PLNW77 Paladia, B. D., Ung, W. C, Norris, P. R., Watson, L. M., Fabian, P. J., Proc. Roy. Soc. Ser. A 354, 269 (1977) PNSS74 + Petrukhin, O. M., Nefedov, V. I., Salyn, Y. V., Shevchenko, V. N.

Zh. Neorg. Khim. 19, 1418 (1974) PWA 79 Pany-Jones, A. C, Weightman, P., and Andrews, P. T.,

J. Phys. C. 12, 1587 (1979) PeKa77 Peterson, L. G., Karlsson, S. E., Phys. Scr. 16, 425 (1977) Pede82 Pederson, L. R.,

J. Electron Spectrosc. Relat. Phenom. 28, 203 (1982) PiLu72 Pignataro, S., Lunazzi, L. Tetrahedron Lett. 52, 5341 (1972)

Pola82 Polak, M.,

J. Electron Spectrosc. Relat. Phenom. 28, 171 (1982) RBO 72 Robert, T., Bartel, M., and Offergeld, G.,

Surf. Sci. 33, 123 (1972) RGBH80 Ryzhkov, M. V., Gubanov, V. A., Butzman, M. P., Hagstrom, A. L., Kurmaev, E. Z.,

J. Electron Spectrosc. Relat. Phenom. 21, 193 (1980) RHJF69 Ramqvist, L., Hamrin, K., Johansson, G., Fahlman, A., and Nordling, C,

J. Phys. Chcm. Solids 30, 1835, (1969) RJBB76 Reisfeld, R., Jorgenson, C. K., Bornstein, A., and Berthou, H., Chimia 30, 451 (1976) RLAT79 Riley, J. D., Ley, L., Azouley, J., Terahura, K., Phys. Rev. B 20, 776 (1979) RLRL83 Rosenberg, R. A., Laroe, P. R., Rehn, V., Loubriel, G. M., Thornton, G., Phys. Rev. B 28, 6083 (1983) RMBR85 Roche, A., Monies, H., Brissot, J., Romand, M., Josseaux, P., De Mesmaeker, A. K., Appl. Surf. Sci. 21, 12 (1985) RNS 73 Rosolovskii, V. Y., Nefedov, V. L, and Sinelnikov, S. M.,

Izv. Akad. Nauk Sssr, Ser. Khim. 7, 1445 (1973) RRD 78 Romand, R., Roubin, M., and Deloume, J. P.,

J. Electron Spectrosc. Relat. Phenom. 13, 229 (1978) RRD 78a Romand, R., Roubin, M., and Deloume, J-P.,

J. Solid State Chem. 25, 59 (1978) RSVH79+ Rao, C. N. R., Sarma, D. D., Vasudevan, S., Hegde, M. S., Proc. R. Soc. London Ser. A 367, 239 (1979) RVJK85 Riga, J., Verbist, J. J., Josseaux, P., Mesmaeker, A. K., Surf. Interface Anal. 7, 163 (1985) RVWK78 Riga, J., Verbist, J. J., Wudl, F., Kruger, A.,

J. Chem. Phys. 69, 3221 (1978) RWJ 75 Roberts, E. D., Weightman, P., and Johnson, C. E.,

J. Phys. C. 8, 1301 (1975) RWW 84 Ricco, A. J., White, H. S., and Wrighton, M. S.,

J. Vac. Sci. Technol. A 2, 910 (1984) Ravc79 Raven, M. S., Surf. Interface Anal. 1, 20 (1979) RiVe83 + Riga, R., Verbist, J. J.,

J. Chem. Soc. Perkin Trans. II 1983, 1545 Rigg72+ Riggs, W. M.,

Anal. Chem. 44, 830 (1972)

[

54
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

RoOf72 Robert, T., and Offergeld, G.

Phys. Status Solidi (A) 14, 277 (1972) RoRo76 Romand, M., Roubin, M.,

Analusis 4, 309 (1976) SATD73 Seals, R. D., Alexander, R., Taylor, L. T., Dillard, J. G., Inorg. Chem. 12, 2486 (1973) SBB 80 Sun, T. S., Buchner, S. P., and Byer, N. E.

J. Vac. Sci. Technol. 17, 1067 (1980) SBG 85 Setiawan, L. D., Baumann, H., and Gribbin, D.,

Surf. Interface Anal. 7, 188 (1985) SCKK75 + Saethre, L. J., Carlson, T. A., Kaufman, J. J., Koski, W. S., Molec. Pharm. 11, 492 (1975) SCT 73 Shevchik, N. J., Cardona, M., and Tejeda, J., Phys. Rev. B 8, 2833 (1973) SDI077 Sharma, J., Downs, D. S., Iqbal, Z., Owens, F. J.,

J. Chem. Phys. 67, 3045 (1977) SDR 80 Shalvoy, R. B., Davis, B. H., and Reucroft, P. J., Surf. Interface Anal. 2, 12 (1980) SFM 80 Seifert, G., Finster, J., and Mueller, H., Chem. Phys. Lett. 75, 373 (1980) SFR 84 Streubel, P., Fellenberg, R., and Rcif, A.,

J. Electron Spectros. Relat. Phemon. 34, 261 (1984) SFS 77 Shalvoy, R. B., Fisher, G. B., and Stiles, P. J., Phys. Rev. B 15, 1680 (1977) SGCT74 + Swartz, W. E., Gray, R. C, Carver, J. C, Taylor, R. C, Hercules, D. M., Spectrochim Acta A 30, 1561 (1974) SGKS79 Schwartz, G. P., Gualticri, G. J., Kammlott, G. W., Schwartz, B.,

J. Electrochem. Soc. 126, 1737 (1979) SGOV82 Sharma, J., Garrett, W. L., Owens, F. J., Vogel, V. L.,

J. Phys. Chem. 86, 1657 (1982) SGRS72 Sharma, J., Gora, T., Rimstidt, J. D., and Staley, R., Chem. Phys. Lett. 15, 233 (1972) SGSO70 Siegbahn, K., Gelius, U., Siegbahn, H., Olson, E., Phys. Scr. 1, 272 (1970) SHH 78 Steiner, P., Hoechst, H., and Hufner, S., Z. Physik B 30, 129 (1978) SHR 82 Sen, P., Hegde, M. S., and Rao, C. N., Appl. Surf. Sci. 10, 63 (1982) SLC083 Su, C. Y., Lindau, I., Chye, P. W., Oh, S. J., Spicer, W. E.,

J. Electron Spectrosc. Relat. Phenom. 31, 221 (1983) SMAV72+ Stec, W. J., Morgan, W. E., Albridge, R. G., Van Wazer, J. R., Inorg. Chem. 11, 220 (1972) SMS 80 Schreifels, J. A., Maybury, P. C, and Swartz, W. E.,

J. Catal. 65, 195 (1980) SMSB81 Salvati, L., Makovsky, L. E., Stencel, J. M., Brown, F. R., Hercules, D. M.,

J. Phys. Chem. 85, 3700 (1981) SNMK78+ Salyn, Y. V., Nefedov, V. I., Makarova, A. G., Kuznetsova, G. N., Zh. Neorg. Khim. 23, 829 (1978) SNRS76+ Sergushin, N. N., Nefedov, V. I., Rozanov, I. A., Slovyanovski, N. B., Gracheva, N. V., Zh. Neorg. Khim. 21, 856 (1976)

55
CHARLES D. WAGNER

SPB 76 Simon, D., Perrin, C, and Baillif, P., C. R. Acad. Sci. Ser. C 283, 241 (1976) SPB 76a Simon, D., Perrin, C, and Bardolle, J.,

J. Microsc. Spectrosc. Electron 1, 175 (1976) SRD 79 Shalvoy, R. B., Reucroft, P. J., and Davis, B. H.,

J. Catal. 56, 336 (1979) SRH 72 Swartz, W. E., Ruff, J. R., and Hercules, D. M.,

J. Am. Chem. Soc. 94, 5228 (1972) SRHH78 Steiner, P., Reiter, F. J., Hoechst, H., Huefner, S., and Fuggle, J. C,

Phys. Lett. 66A, 229 (1978) SRHH78a Steiner, P., Reiter, F. J., Hoechst, H., Huefner, S., and Fuggle, J. C,

Phys. Status Solidi (B) 90, 45 (1978) SRHR79+ Sarode, P. R., Rao, K. J., Hegde, M. S., Rao, C. N. R.,

J. Phys. C. 12,4119 (1979) SSEW79 + Srinivasan, V., Stieffel, E. I., Elsbeny, A., Walton, R. A.,

J. Am. Chem. Soc. 101, 2612 (1979) SSHU83 Schuize, P. D., Shaffer, S. L., Hance, R. L, and Utiey, D. L.

J. Vac. Sci. Technol. A 1, 97 (1983) SSOT81 Suzuki, K., Soma, M., Onishi, T., Tamaru, K.,

J. Electron Spectrosc. Relat. Phcnom. 24, 283 (1981) STA 74+ Seno, M., Tsuchiya, S., and Asahara, T., Chem. Lett. 1974, 405 STAB76 Shulga, Y. M., Troitskii, V. N., Aivazov, M. I., Borodtco, Y. G., Zh. Neorg. Khim. 21, 2621 (1976) STHU76+ Seno, M., Tsuchiya, S., Hidai, M., Uchida, Y.,

Bull. Chem. Soc. Jpn. 49, 1184 (1976) SWH 71 Swartz, W. E., Wynne, K. J., and Hercules, D. M., Anal. Chem. 43, 1884 (1971) SaBa85 Sasaki, T. A., Baba, Y., Phys. Rev. B 31, 791 (1985) SaPo79 Sawatzky, G. A., Post, D., Phys. Rev. B 20, 1546 (1979) SaRaSO Sarma, D. D., Rao, C. N. R.,

J. Electron Spectrosc. Relat. Phenom. 20, 25 (1980) ScBrSl Schaerii, M., and Brunner, J., Z. Phys. B 42, 285 (1981) ScLa79 Schneider, W. D., Laubschat, C,

Phys. Rev. B 20, 4416 (1979) ScLaSO Schneider, W. D., Laubschat, C,

Physica 102B, 111 (1980) ScLa81 Schneider, W-D., Laubschat, C,

Phys. Rev. B 23, 997 (1981) ScOs82 Schlapbach, L., Osterwalder, J., Solid State Commun. 42, 271 (1982) ScSc82 Schlapbach, L., Scherrer, H. R., Solid State Commun. 41, 893 (1982) Scho72 Schoen, G.

J. Electron Spectrosc. Relat. Phenom. 1, 377 (1972) Scho73 Schoen, G., Acta Chem. Scand. 27, 2623 (1973)

56
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

I

Scho73a

Scho73b

SeAv83

SeSoSl

SeTs76 +

Shlq78

ShRe79

ShTr75

Sher76

ShutSO

SiLc78

SiWoSO

SIDcSl

SIWi79

SmB184

SmWa77 +

SrWa77

StEd75

StHe84

StHo79

SuFa74

SwAI74 +

SwHe71 +

Swif82

TBHH77 +

Schoen, G.,

J. Electron Spectrosc. Relat. Phenom. 2, 75 (1973)

Schoen, G.,

Surf. Sci. 35, 96 (1973)

Sexton, B. A., Avery, N. R., Surf. Sci. 129, 21 (1983) Seyama, H., Soma, M., Chem. Lett. 1981, 1009

Seno, M., Tsuchiya, S.,

J. Electron Spectrosc. Relat. Phenom. 8, 165 (1976) Sharma, J., Iqbal, Z., Chem. Phys. Lett. 56, 373 (1978)

Shalvoy, R. B., and Reucroft, P. J.

J. Vac. Sci. Technol. 16, 567 (1979)

Shabanova, L N., and Trapeznikov, V. A.

J. Electron Spectrosc. Relat. Phenom. 6, 297 (1975) Sherwood, P. M. A.,

J. Chem. Soc. Faraday Trans. II 72, 1806 (1976)

Shuttleworth, D.,

J. Phys. Chem. 84, 1629 (1980)

Sinharoy, S., Levenson, L. L., Thin Solid Films 53, 31 (1978)

Sinharoy, S., Wolfe, A. L.,

J. Electron Spectrosc. Relat. Phenom. 18, 369 (1980)

Slinkard, W. E., Degroot, P. B.,

J. Catal. 68, 423 (1981)

Slusser, G. J., Winograd, N.,

Surf. Sci. 84, 211 (1979)

Smith, K. L., Black, K. M.,

J. Vac. Sci. Technol. A 2, 744 (1984)

Smith, T. J., Walton, R. A.,

J. Inorg. Nucl. Chem. 39, 1331 (1977)

Srinivasan, R., Walton, R. A.

Inorg. Chim. Acta 25, L85 (1977)

Stevens, G. C, Edmonds, T.,

J. Catal. 37, 544 (1975)

Strohmeier, B. R., Hercules, D. M.,

J. Phys. Chem. 88, 4922 (1984)

Steiner, P., Hoechst, H., Z. Phys. B 35, 51 (1979)

Su, C, Faller, J. W.,

Inorg. Chem. 13, 1734 (1974)

Swartz, W. E., Alfonso, R. A.,

J. Electron Spectrosc. Relat. Phenom. 4, 351 (1974)

Swartz, W. E., Hercules, D. M., Anal. Chem. 43, 1774 (1971)

Swift, P., Surf. Interface Anal. 4, 47 (1982) Thomas, V. P., Beyer, L., Hennig, K., Hoyer, E., Nefedov, V. I., Zumadilov, E. K., Z. Anorg. Allg. Chem. 437, 299 (1977)

57
CHARLES D. WAGNER

TBVL82 Thibaut, E., Boutique, J., Verbist, J. J., Level, J. -C, Noel, H.,

J. Am. Chem. Soc. 104, 5266 (1982) THC 83 Tobin, J. P., Hirschwald, W., and Cunningham, J., Appl. Surf. Sci. 16, 441 (1983) TINKSl + Tsutsumi, T., Ikemoto, I., Namikawa, T., Kuroda, H.,

Bull. Chem. Soc. Jpn. 54, 913 (1981) TIWB72 Thomas, J. M., Adams, I., Williams, R. H., Barber, M.,

J. Chem. Soc. Faraday Trans. II 68, 755 (1972) TLIR78 Taylor, J. A., Lancaster, G. M., Ignatiev, A., Rabalais, J. W.,

J. Chem. Phys. 68, 1776 (1978) TLR 78 Taylor, J. A., Lancaster, G. M., and Rabalais, J. W.,

J. Electron Spectrosc. Relat. Phenom. 13, 435 (1978) TMR 80 Turner, N. H., Murday, J. S., and Ramaker, D. E., Anal. Chem. 52, 84 (1980) TRLK73+ Tolman, C. A., Riggs, W. M., Linn, W. J., King, C. M., Wendt, R. C,

Inorg. Chem. 12, 2772 (1973) TSH 84 Takahashi, T., Sagawa, T., and Hamanoka, H.,

J. Non-Ciyst. Solids 65, 261 (1984) TSOT80 Takagi-Kawai, M., Soma, M., Onishi, T., Tamaru, K., Can. J. Chem. 58, 2132 (1980) TVG 76 Teuret-Noel, C, Verbist, J., and Gobillon, Y.,

J. Microsc. Spectrosc. Electron 1, 255 (1976) TaPc84 Taylor, J. A., Perry, D. L.,

J. Vac. Sci. Technol. A 2, 771 (1984) TaRaSl Taylor, J. A., and Rabalais, J. W.,

J. Chem. Phys. 75, 1735 (1981) Tapp82 Tapping, R. L., Inorg. Chem. 21, 1691 (1982)

Tayl78 Taylor, J. A., Appl. Surf. Sci. 1, 506 (1978)

Tayl81 Taylor, J. A., Appl. Surf. Sci. 7, 168 (1981)

Tayl82 Taylor, J. A.,

J. Vac. Sci. Technol. 20, 751 (1982) TcLc79 Terzieff, P., Lee, K.,

J. Appl. Phys. 50, 3566 (1979) ThSh78 Thomas, J. R, and Sharma, S. P.

J. Vac. Sci. Technol. 15, 1707 (1978) Thom81 + Thomas, P., Z. Anorg. Allg. Chem. 477, 144 (1981) TrRi82 Trowbridge, L. D., and Richards, H. L., Surf. Interface Anal. 4, 89 (1982)

Tric74 Tricker, M. J., Inorg. Chem. 13, 743 (1974) UBS 83+ Umapathy, P., Badrinaryanan, S., and Sinha, A. P. B.

J. Electron Spectrosc. Relat. Phenom. 28, 261 (1983) UIY 84 Uwamino, Y., Ishizuka, Y., and Yamatera, H.,

J. Electron Spectrosc. Relat. Phenom. 34, 69 (1984) USK 80 Usami, K., Shimada, T., and Katayama, Y., Jpn. J. Appl. Phys. 19, L389 (1980)

58
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

UeOdSl Ueno, T., Odajima, A., Jpn. J. Appl. Phys. 20, L501 (1981) UeOd82 Ueno, T., Odajima, A., Jpn. J. Appl. Phys. 21, 230 (1982) Ueno83 Ueno, T., Japan J. Appl. Phys. 22, 1349(1983)

UmRe78 Umezawa, Y., Reilley, C. N., Anal. Chem. 50, 1294 (1978) VHE 82 Van Der Veen, J. R, Himpsei, F. J., and Eastman, D. E. Phys. Rev. B 25, 7388 (1982) VHVH80 Van Der Heide, H., Hemmel, R., Van Bruggen, C. F., Haas, C,

J. Solid State Chem. 33, 17 (1980) VLDH77 Veal, B. W., Lam, D. J., Diamond, H., Hoekstra, H. R., Phys. Rev. B 15, 2929 (1977) VLG 83 Vasquez, R. P., Lewis, B. F., and Grunthaner, F. J.,

J. Vac. Sci. Technol. B 1, 791 (1983) VRPC74 Verbist, J, Riga, J., Pireaux, J. J., Caudano, R.,

J. Electron Spectrosc. Relat. Phenom. 7, 193 (1974) WT 80+ Van Attekum, J. M. Th. M., Van Der Velden, J. W. A., and Trooster, J. M.,

Inorg. Chem. 19, 701 (1980) VWHS81 Van Der Laan, G., Westra, C, Haas, C, and Sawatzky, G. A., Phys. Rev. B 23, 4369 (1981) VWVB77 Van De Vondel, D. F., Wuyts, L. F., Van Der Kelen, G. P., Bevemage, L.

J. Electron Spectrosc. Relat. Phenom. 10, 389 (1977) VaGr81 Vasquez, R. P., Grunthaner, F. J.

J. Appl. Phys. 52, 3509 (1981) VaTr78 Van Attekum, P. M. Th. M., and Trooster, J. M.,

J. Phys. F. 8, L169 (1978) VaTr78a Van Attekum, P. M. Th. M., Trooster, J. M.,

Phys. Rev. B 18, 3872 (1978) VaTr79 Van Attekum, P. M. Th. M., Trooster, J. M.,

Phys. Rev. B 20, 2335 (1979) VaTr79a Van Attekum, P. M. Th. M., Trooster, J. M.,

J. Phys. F. 9, 2287 (1979) VaTrSO Van Attekum, P. M., Trooster, J. M.,

J. Electron Spectrosc. Relat. Phenom. 18, 1354 (1980) VaVc80 Van Doveren, H., and Verhoeven, J. A. Th.,

J. Electron Spectrosc. Relat. Phenom. 21, 265 (1980) Van077 Van Ooij, W. J., Surface Technology 6, 1 (1977) Vann76 Vannerberg, N. -G. Chem. Scr. 9, 122 (1976) VayrSl Vayrynen, J.,

J. Electron Spectrosc. Relat. Phenom. 22, 27 (1981) VcLa71 + Vesely, C. J., Langer, D. W.,

Phys. Rev. B 4, 451 (1971) VeLa74 Veal, B. W., Lam, D. J., Phys. Rev. B 10, 4903 (1974) VeVa82 Verhoeven, J. A. Th., Van Doveren, H.,

Surf. Sci. 123, 369 (1982)

59
CHARLES D. WAGNER

WAP 79 Weightman, P., Andrews, P. T., and Pany-Jones, A. C,

J. Phys. C. 12, 3635 (1979) WHG 73 Wertheim, G. K., Huefner, S., and Guggenheim, H. J., Phys. Rev. B 7, 556 (1973) WHMC78 Wittberg, T. N., Hoenigman, J. R., Moddeman, W. E., Cothern, C. R., Gulctt, M. R.,

J. Vac. Sci. Technol. 15, 348(1978)

WHP 71 Watson, R. E., Hudis, J., and Perlman, M. L., Phys. Rev. B 4, 4139 (1971) WPT 79 Wren, A. G., Phillips, R. W., and Toientino, C. U.,

J. Colloid Interface Sci. 70, 544 (1979) WSP 77 Weser, U., Sokolowski, G., and Pilz, W.,

J. Electron Spectrosc. Relat. Phenom. 10, 429 (1977) WVB 80 Wertheim, G. K., Van Attekum, P. M. Th. M., and Basu, S., Solid State Commun. 33, 1127 (1980) WW 79+ Willemen. H., Van De Vondel, D. R, and Van Der Kelen, G. P., Inorg. Chim. Acta 34, 175 (1979) WWC 78 Wertheim, G. K., Wemick, J. H., and Crecelius, G., Phys. Rev. B 18, 878 (1978) WWW77 Willemen,H., Wuyts, L. F., Van De Vondel, D. F-, Van Der Kelen, G. P.,

J. Electron Spectrosc. Relat. Phenom. 11, 245 (1977) WZR 80 + Wagner, C. D., Zatko, D. A., and Raymond, R. H., Anal. Chem. 52, 1445 (1980) WaBi73 Wagner, C. D., and Biloen, P., Surf. Sci. 35, 82 (1973) WaHu74 Watts, P. H., Huheey, J. E., Inorg. Nucl. Chem. Lett. 10, 287 (1974) WaTa80+ Wagner, C. D., Taylor, J. A.,

J. Electron Spectrosc. Relat. Phenom. 20, 83 (1980) WaTa82 Wagner, C. D., Taylor, J. A.,

J. Electron Spectrosc. Relat. Phenom. 28, 211 (1982) Wagn75 Wagner, C. D., Discuss. Faraday Soc. 60, 291(1975)

Wagn78 + Wagner. C. D.,

J. Vac. Sci. Technol. 15, 518(1978)

WagnSO Wagner, C. D.,

J. Electron Spectrosc. Relat. Phenom. 18, 345 (1980) Walt77+ Walton, R. A.,

J. Inorg. Nucl. Chem. 39, 549(1977) Walt77a Walton, R. A.,

J. Less Common Metals 54, 71 (1977) WeAnSO Weightman, P., and Andrews, P. T.,

J. Phys. C. 13, L815, L821 (1980) WcAn80a Weightman, P., and Andrews, P. T.,

J. Phys. C. 13, 3529 (1980) WeCa82 West, R. H., and Castle, J. E., Surf. Interface Anal. 4, 68 (1982) WeMe78 Westerhof, A., Meijer, H. J. D.,

J. Organometal. Chem. 144, 61(1978)

Weig76 Weightman, P.,

J. Phys. C. 9, 1117(1976)

60
THE NIST X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) DATABASE

WhFa84 Wheeler, D. R., Faut, O. D., Appl. Surf. Sci. 18, 106(1984) WiWa83 Wittberg, T. N. and Wang, P. S.

J. Electron Spectrosc. Relat. Phenom. 31, 81 (1983) YMK 78 + Yamashita, M., Matsumoto, N., and Kida, S., Inorg. Chim. Acta 31, L381 (1978) YSMN73 + Yoshihara, K., Shiokawa, T., Maeda, K., Nakai, Y., Chem. Lett. 1973, 380 YYS 78+ Yoshida, T., Yamasaki, K., and Sawada, S., Bull. Chem. Soc. Jpn. 51, 1561 (1978) YYS 79+ Yoshida, T., Yamasaki, K., and Sawada, S., Bull. Chem. Soc. Jpn. 52, 2908 (1979) YaBa80 Yang, S. J., and Bates, C. W.,

Appl. Phys. Lett. 36, 675 (1980) YaWe83 Yates, K., West, R. H.,

Surf. Interface Anal. 5, 133 (1983) YaYa79 Yamamoto, P., Yamakama, S.,

J. Polym. Sci. Polym. Phys. 17, 1581 (1979) YoSa74 + Yoshida, T., Sawada, S., Bull. Chem. Soc. Jpn. 47, 50 (1974) YoSa74a Yoshida, T., Sawada, S., Bull. Chem. Soc. Jpn. 47, 1024 (1974) YoSa75 + Yoshida, T., Sawada, S., Bull. Chem. Soc. Jpn. 48, 345(1975)

YoYa81 + Yoshida, T., Yamasaki, K.,

Bull. Chem. Soc. Jpn. 54, 935(1981)

Yosh78+ Yoshida, T., Bull. Chem. Soc. Jpn. 51, 3257 (1978) Yosh80+ Yoshida, T., Bull. Chem. Soc. Jpn. 53, 498(1980) Yos + 80a Yoshida, T., Bull. Chem. Soc. Jpn. 53, 1327, (1980) Yos + 80b Yoshida, T., Bull. Chem. Soc. Jpn. 53, 1449 (1980) ZBN 83 Zakharov, A. I., Batirev, I. G., and Narmonev, A. G.,

Solid State Commun. 46, 739 (1983) ZMN 78+ Zhumadilov, E. K., Markova, E. L, and Nefedov, V. L, Koord. Khim. 4, 997 (1978) ZMTB80 Zingg, D. S., Makovsky, L. E., Tischer, R. E., Brown, F. R., Hercules, D. M.,

J. Phys. Chem. 84, 2898 (1980) ZSOS79 Zhdan, P. A., Shepelin, A. P., Osipova, Z. G., Sokolovskii, V. D.,

J. Catal. 58, 8 (1979) ZcHa71 Zeller, M. V., and Hayes, R. G., Chem. Phys. Lett. 10, 610 (1971) ZeMa79 Zehner, D. M., and Madden, H. H.,

J. Vac. Sci. Technol. 16, 562(1979)

Zemb81 Zembutsu, S., Appl. Phys. Lett. 39, 969 (1981) ZiHe78 Zingg, D. S., Hercules, D. M.,

J. Phys. Chem. 82, 1992 (1978)

61
Appendix C. Figures \ N(E) /E

cf3" a

C/3 ee — n

•^aBo we ~

v> e O

D.C3 «

rr e —

v; e CL

>-i ^ s 3 X U1 •^ o ^ w-§. Z e o o m ^» ^ 1 H z n w o _ <^ e ^ m

c«

m e z

howing p +

hv, m zm

m

3} < ee . < O 3- ^^

difi oto 7 < 3 « <^^ eo o o — o o 3

M-^ 3n

vo

V ee ^

00o

-n

,^^ 3 e » » e 3C> ^

00 * ^

<rS e "» o

•oV"103 ^ 3 to n e —

62
240 230

BINDING ENERGY. eV

220

Figure 2. Doublet separation in photoelectron line.

63
240 230

BINDING ENEHGY. eV

220

Figure 3. Chemical shift from elemental form.

64
-T 1 .

1—

T

Zn(LMM)

I I I I

427

N(E)

I I I L3M„M«

261.2

I I I f

L3M„M«

348.4

h 64.3-

« 78.8-

87.2-

''*'' I 1^ 1 L

238.2

J L J 1 I

' ' ' ' ' 460 410 360 310 260 210

Figure 4. Separation from the sharpest Auger line.

65

NIST-114A

(REV. 3-90) U.S. DEPARTMENT OF COMMERCE

NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY

BIBLIOGRAPHIC DATA SHEET

1. PUBUCATION OR REPORT NUMBER

NIST/TN-lZSg

2. PERFORMING ORGANIZATION REPORT NUMBER

3. PUBUCATION DATE October 1991

4. TITLE AND SUBTITLE

The NIST X-Ray Photoelectron Spectroscopy (XPS) Database

S. AUTHOR(S)

Charles D. Wagner

6. PERFORMING ORGANIZATION (IF JOINT OR OTHER THAN NIST, SEE INSTRUCTIONS)

U.S. DEPARTMENT OF COMMERCE

NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY

QAITHERSBURG, MD 20899

7. CONTRACT/GRANT NUMBER

8. TYPE OF REPORT AND PERIOD COVERED

Final

9. SPONSORING ORGANIZATION NAME AND COMPLETE ADDRESS (STREET, CITY, STATE, ZIP)

Same as item 6.

10. SUPPLEMENTARY NOTES

11. ABSTRACT (A 200-WORD OR LESS FACTUAL SUMMARY OF MOST SIGNIFICANT INFORMATION. IF DOCUMENT INCLUDES A SIGNIFICANT BIBUOGRAPHY OR

UTERATURE SURVEY, MENTION IT HERE.)

The technique known as XPS (X-Ray Photoelectron Spectroscopy) involves x-ray

irradiation of surface samples under high vacuum. Electrons escaping from the

samples are sorted and arranged to form a spectrum. A compilation of data for

binding energy and kinetic energy of sample electrons from all elments has been

collected. Depending on the nature of the chemical bond, the chemical shift

can be as much as 10 eV. Over the past 6 years the author has indexed articles

related to this subject area. The data bank contains a total of 13,200 records,

from a total of 800 papers.

12. KEY WORDS (6 TO 12 ENTRIES; ALPHABETICAL ORDER; CAPITAUZE ONLY PROPER NAMES; AND SEPARATE KEY WORDS BY SEMICOLONS)

Auger electron; Auger parameter; binding energy; chemical shift; core level;

doublet separation; photoelectron; XPS; X-Ray generation

13. AVAILABIUTY UNUMITED

FOR OFFICIAL DISTRIBUTION. DO NOT RELEASE TO NATIONAL TECHNICAL INFORMATION SERVICE (NTIS). ORDER FROM SUPERINTENDENT OF DOCUMENTS, U.S. GOVERNMENT PRINTING OFFICE, WASHINGTON, DC 20402. ORDER FROM NATIONAL TECHNICAL INFORMATION SERVICE (NTIS), SPRINGFIELD, VA 22161.

14. NUMBER OF PRINTED PAGES

69

15. PRICE

ELECTRONIC FORM *U.S.G. P.O.: 1991 -31 1-891: 40052

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