Center for Electronics and

Electrical Engineering

Technical

Progress

Bulletin

Covering Center Programs,

July to September 1985 with

1986 CEEE Events Calendar

March 1 986

U.S. Department of Commerce

National Bureau of Standards

National Engineering Laboratory

Gaithersburg, Maryland 20899

-QC

100

• U 5 6

86-3344

1986
NATIONAL INSTITUTE OF STANDARDS &

TECHNOLOGY

Research Information Center

INTRODUCTION TO MARCH 1 ^#^1^^^t1^Ce§^^chnical PROGRESS BULLETIN

This is the twelfth issue of a quarterly publication providing information on the

technical work of the National Bureau of Standards Center for Electronics and Electrical Engineering. This issue of the CEEE Technical Progress Bulletin covers the

third quarter of calendar year 1985.

Organization of Bulletin : This issue contains abstracts for all Center papers re- leased tor publication by NBS in the quarter and citations and abstracts for Center

papers published in the quarter. Entries are arranged by technical topic as identified in the table of contents and alphabetically by first author under each subheading within each topic. Unpublished papers appear under the subheading "Released for

Publication". Papers published in the quarter appear under the subheading "Recently

Published". Following each abstract is the telephone number of the individual to

contact for more information on the topic; unless otherwise noted, this person is the

first author. This issue also includes a calendar of Center conferences and workshops planned for fiscal year 1986, an announcement of recently issued standard

reference materials, and a list of sponsors of the work.

Center for Electronics and Electrical Engineering ; Center programs provide national

reference standards, measurement methods, supporting theory and data, and traceability to national standards.

The metrological products of these programs aid economic growth by promoting equity

and efficiency in the marketplace, by removing metrological barriers to improved

productivity and innovation, by increasing U. S. competitiveness in international

markets through facilitation of compliance with international agreements, and by

providing technical bases for the development of voluntary standards for domestic and

international trade. These metrological products also aid in the development of

rational regulatory policy and promote efficient functioning of technical programs of

the Government.

The work of the Center is divided into two major programs: the Semiconductor Technology Program, carried out by the Semiconductor Electronics Division (formerly the

Semiconductor Materials and Processes and the Semiconductor Devices and Circuits

Divisions) in Gaithersburg, MD, and the Signals and Systems Metrology Program, car- ried out by the Electrosystems Division in Gaithersburg and the Electromagnetic

Fields and Electromagnetic Technology Divisions in Boulder, CO. Key contacts in the

Center are given on the back cover; readers are encouraged to contact any of these

individuals for further information. To request a subscription or for more information on the Bulletin , write to CEEE Technical Progress Bulletin, National

Bureau of Standards, Metrology Building, Room B-358, Gaithersburg, MD 20899 or call

(301) 921-3357.

Center sponsors: Hie Center Programs are sponsored by the National Bureau of standards and a number of other organizations, in both the Federal and private sectors;

these are identified on page 31.

Note on Publication Lists: Guides to earlier as well as recent work are the publication lists covering the work of each division. These lists are revised and reissued

on an approximately annual basis and are available from the originating division.
CEEE Technical Progress Bulletin - March 86

TABLE OF CONTENTS

Page

0J (Oo

'-m

INTRODUCTION

SEMICONDUCTOR TECHNOLOGY PROGRAM

Analysis Techniques

Dimensional Metrology

Integrated Circuit Test Structures . . . . . Process and Device Modeling

Packaging

Other Semiconductor Metrology Topics . . . .

SIGNALS AND SYSTEMS METROLOGY PROGRAM

FAST SIGNAL ACQUISITION, PROCESSING, & TRANSMISSION

Waveform Metrology

Cryoelectronic Metrology

Antenna Metrology . . Noise Metrology . Microwave Metrology

Laser Metrology

Optical Fiber Metrology . Other Fast Signal Topics

ELECTRICAL SYSTEMS

Power Systems Metrology

Pulse Power Metrology . . Superconductors

Magnetic Materials and Measurements

Other Electrical Systems Topics ......

ELECTROMAGNETIC INTERFERENCE

1986 CEEE CALENDAR

RECENTLY ISSUED STANDARD REFERENCE MATERIALS

SPONSOR LIST

KEY CONTACTS IN CENTER, CENTER ORGANIZATION .

inside front cover

. . 2

. . 2

. . 3

. . 4

. . 6

. . 6

. . 7

. . 7

. . 9

. . 1 1

. . 1 3

. . 1 4

. . 1 5

. . 1 6

. . 1 7

. . 20

. . 20

. . 22

. . 22

. . 25

. . 25

. . 25

. . 29

. . 30

. . 31

back cover
Page 2 CEEE Technical Progress Bulletin - March 86

SEMICONDUCTOR TECHNOLOGY PROGRAM

Analysis Techniques

Released for Publication

Baghdadi, A., Gladden, W.K. , and Flach,

D.Ro, Nonlinear Effects of Digitizer

Errors in FT-IR Spectroscopy.

This paper is an investigation of the

effects of errors in the analog- todigital converter (ADC) of a Fourier

transform infrared (FT-IR) spectrometer

on the photometric accuracy of that

spectrometer. The effect of ADC errors on the spectrum after Fourier transformation is calculated analytically for

monochromatic, two-line and wide squareband emission spectra. Numerical modeling is used to extend the analysis to

absorption spectra, and to include the

effects of noise on the amplitude of

absorbance bands. These analyses showed

that ADC errors can generate artifacts

throughout the spectrum, although the

largest effects occur at sharp spectral

features. Errors as large as 8% in the

amplitude of absorbance bands can be

produced by ADC errors of one least

significant bit ( LSB) , in a 15-bit ADC.

These results were confirmed qualitatively by measuring the net height of

the oxygen vibrational band in silicon

at 1107 cm" 1 using four different ADC

circuit boards in the same FT-IR spectrometer. At the highest signal levels,

the boards disagreed by as much as 4%,

even though the static transfer characteristics of the ADC boards (which were

measured in a separate experiment) ex- hibited errors of less than ±2 LSBs.

[Contact: (301) 921-3786]

Dimensional Metrology 1

Released for Publication

Kirk, C.P., and Nyyssonen, D. , Modeling the Optical Microscope Images of

Thick Layers for the Purpose of Linewidth Measurement, Proc. SPIE - The

International Society for Optical

Engineering, Vol. 538, pp. 179-187

[Conference, Santa Clara, California,

March 1 3-1 4, 1 985] .

A monochromatic, waveguide model is

presented which can predict the optical

microscope images of thick layer objects

including multi-layer structures, sloping, curved and undercut edges, granular

structures such as polysilicon and asymmetric objects. The model is used to

investigate the effects of line structure on the optical image and good

agreement with experimentally obtained

optical image profiles is demonstrated.

Implementation of the model is described

by way of example and the measurements

involved in the different stages of

manufacturing an MOS device are discussed.

[Contact: Robert D. Larrabee (301)

921-3625]

Nyyssonen, D. , A Practical Method for

Edge Detection and Focusing for Linewidth Measurements on Wafers, Proc.

SPIE - The International Society for

Optical Engineering, Vol. 538, pp.

172-178 [Conference, Santa Clara,

California, March 1 3-14, 1985].

Lack of precision and accuracy of mprocess critical dimension (CD) measurements of linewidth continues to be a serious problem at micrometer and submicrometer dimensions. Even with highly

repeatable optical linewidth measurement

systems, variable "offsets" or errors

have been shewn to occur with changes in

process variables such as thickness of

the patterned layer and sublayers and

changes in the indices of refraction of

the materials. All of these variations

result in changes in the optical phase

difference which occurs on reflection it the line edge and, therefore, results in

changes in the structure of the optical

image. Although an accurate coherent

optical edge detection method has been

1 This work was transferred to the Center for Manufacturing Engineering, Preci n >n Engineering Division, at the beginning of Fiscal Year 1986 (Oct. 1, 1985)
CEEE Technical Progress Bulletin - March 86 Page 3

Dimensional Metrology , cont' d.

developed, it requires accurate knowledge of the phase difference, which is

not always possible in CD measurements.

This paper proposes a new edge detection

and focusing method, based on image

theory, which can be adapted to most

optical microscope-based measurement

systems. It does not require knowledge

of the phase difference at the line

edge. The accuracy of this criterion is

compared to the more widely used criteria of the minimum and 50% threshold

and it is concluded that, when the phase

difference is unknown and varies with

normal processing, the new dual threshold method is the superior method.

[Contact: Robert D. Larrabee (301)

921-3625]

Integrated Circuit Test Structures

Released for Publication

Linholm, L.W., Cresswell, M.W., Coleman,

E.S., and Partlow, W .D . , Design,

Fabrication, and Testing of an interconnect Test Structure for Evaluating

VLSI Processes, to be published in

the 1985 Digest of Papers, Government

Microcircuit Applications Conference,

Orlando, Florida, November 5-7, 1985.

This paper describes a systematic approach to the comparative experimental

evaluation of alternative sub-micron

lithographic methods using microelectronic test structures. Measurements

are presented for both polysilicon and

aluminum lines with design geometries of

0.6 to 2.0 ym. These structures provide

unambiguous results which can be used as

a tool to improve the control and performance of VLSI devices.

[Contact: (301) 921-3801]

Radack, D.J., Yao, C.T., Linholm, L.W.,

Galloway, K.F., and Lin, H.C., Comparison of Microelectronic Test Structures for Propagation Delay Measurements, to be published in the Microelectronics Journal.

This paper presents a comparison of the

ring oscillator, the inverter chain, and

the delayed Johnson counter for measurement of the propagation delay of an

inverter. The paper describes design

considerations that will improve the

precision and accuracy of the measurement. Additionally, the paper describes

modifications to the delayed Johnson

counter which allow timing comparisons

to be performed on-chip.

[Contact: (301) 921-3801]

Schafft, H.A., Standards for Electromigration Testing, to be published in

the Proceedings of the 1984 Wafer Reliability Assessment Workshop, Lake

Tahoe, California, September 30-October

3, 1984.

This is an edited transcript of a talk

given at the 1984 Wafer Reliability

Assessment Workshop which includes questions, comments, and responses. The

talk described plans for an interlaboratory experiment and other work that is

intended to lead to an improved way for

characterizing metallizations for electromigration. The talk outlined the

steps of the inter laboratory experiment,

discussed some of the design features of

the test structures to be used, described the electromigration test chip,

and mentioned some of the experiments

that will be performed.

[Contact: (301) 921-3801]

Recently Published

Yen, D., Glendinning, W. B., and Linholm, L. W., An Electrical Test

Structure for Proximity Effects Measurement and Correction, J. Electrochem. Soc. , Vol. 132, No. 7, pp. 1726-

1729 (July 1985)

This paper describes the design of a test structure and electrical test method for estimating the magnitude of proximity effects in electron-beam lithography. The test structure consists of a van der Pauw cross resistor for measuring sheet resistance, a bridge resistor

for measuring electrical linewidth, and
Page 4 CEEE Technical Progress Bulletin - March 86

IC Test Structures , cont'd.

a second bridge resistor simulating a close line- space environment for mea- suring electrical linewidth where proximity exposure effects from nearby patterns may be encountered. In this ex- periment, test structures were delineated in aluminum on silicon wafers using

electron-beam exposure and wet chemical

etching. Electrical measurements from

these test structures are compared to

optical measurements to verify the mea- surement method. In addition, results

from the test structures are used to

estimate the Gaussian parameters for the

Gaussian model commonly used for proximity corrections.

[Contact: Loren W. Linholm (301) 921-

3801]

Process and Device Modeling

Released for Publication

Dutta, P.K., and Wilson, C.L., Calculation of Surface Potential and Electron Density Near Threshold for a Nonuniforsnly Doped Channel VDMOS Power

Device.

The surface potential, i|> s , and electron density, n, along the nonuniformly

doped channel of a power DMOS transistor

are computed, using both a charge-sheet

model and a two-dimensional model.

Results are obtained for gate voltages

in the range of 2.0 V to 4.0 V. The

threshold of the device is about 3.0 V.

Nonuniformity in the channel doping of

the transistor requires a point-by-point

calculation of and n, as one progresses from the drain end to the source

end. The results indicate that near threshold, a simple charge-sheet model

can adequately approximate the rigorous

two-dimensional analysis for calculation

of and n. The charge-sheet model

calculation is approximately 800 times

faster than the two-dimensional model

calculation.

[Contact: (301) 921-3621]

Hefner, A.R., and Blackburn, D.L., An

Analytical Model of the Power Insulated

Gate Bipolar Transistor.

A basic equivalent circuit model for the

power Insulated Gate Bipolar Transistor

( IGBT) is developed. It is shown that

the IGBT behaves as a wide-base bipolar

transistor which is supplied base cur- rent by a MOSFET. Analytical expressions are developed, using ambipolar

transport theory, for the electron and

hole current densities and for the ex- cess carrier concentrations in the

thick, lightly doped epitaxial layer of

the IGBT. Expressions are also developed for the steady-state anode to

cathode voltage drop and the transient

anode current waveform, which consists

of an initial rapid fall followed by a slowly decaying portion. The value of

Bfran (the ratio of the value of

the current immediately after the

initial rapid fall to the magnitude of

the fall) is shown to depend on the

anode loading conditions and to be different from the steady-state common emitter current gain of the wide-base

bipolar transistor. Measured and predicted values of Btran f° r constant

anode voltage load conditions as functions of anode current and neutral base

width agree to within experimental error, in the current range where ambipolar transport theory is valid. Device

parameters extracted from the measured

Btran-versus-ano<^ e-current characteristics are used to predict the on- state voltage versus current characteristics, which agree to within a few

millivolts with the measured results.

[Contact: (301) 921-3621]

Lowney, J.R., Impurity Bands and Rand

Tailing in Moderately Doped Silicon.

The density of states of the valence and

conduction bands in silicon ieen

calculated at room temperature for

dopant densities near the transition

between the existence of a distinct

impurity band and its coalesceno

the continuum band to form a band tail.

The dopant densities for the three cases considered are: 1) 1.5 * 1O* 0 cm

- ' ac- ceptors; 2) 6.2 x 1O 10 cm" 3 acc<
CEEE Technical Progress Bulletin - March 86 Page 5

Process & Device Modeling , cont' d.

and 3) 1.2 x 10 13 cm-3 donors compensated by 6.2 x 10 18 acceptors. The

calculation is based on multiple-scattering theory with the self-energy calculated self-consistently to all orders

of the interaction. The results show a small but significant amount of effective band-gap narrowing.

[Contact: (301) 921-3786]

Roitman, P. , Wilson, C.L. , Blue, J.L. , and Galloway, K. F., Measurements for

Accurate MOS Transistor Simulation,

to be published in the Proceedings of

the 3rd International Workshop on the

Physics of Semiconductor Devices,

Delhi, India, November 27-December 2,

1 985.

Measurements and input data required for

accurate numerical simulation of MOS

transistor characteristics are described. Techniques for determining

dopant atom distributions, geometric

parameters, and carrier mobility in the

channel are discussed. Hie results are used to simulate the electrical characteristics of self -aligned, silicon-gate,

n-channel MOSFETs with phosphorus

source-drains having channel lengths of

0.80 pm, 1.83 pm, and 8.17 pm. It is

possible to model the drain current for

all of the transistors studied without

adjustable parameters. If sufficiently

accurate parameters are available, the

characteristics of submicron transistors

can be predicted with ±5% accuracy.

[Contact: (301) 921-3621]

Wilson, C.L. , Using Silicon Device

Modeling Techniques for GaAs Devices,

to be published in the Technical

Digest, 1985 International Electron

Devices Meeting, Washington, DC,

December 1-4, 1985.

Numerical models have been developed for

Si MOSFETs which achieve high accuracy

and retain numerical stability and

physical flexibility. The methods used

in these models can be applied to GaAs

MESFETs to yield a computer model which

retains the accuracy and robust numerical properties of two-dimensional Si

MOSFET models yet retains most of the

physical detail of Monte Carlo simulation. Two significant differences between this model and previous models

result. First, by incorporating intraband scattering directly, high field

regions of the device are seen to be

dominated by alternate regions in which

conduction by central valley and satellite valley electrons dominate. Second,

the two-dimensional field shape in the

part of the transistor between the gate

and the drain is critical in calculating

the intraband scattering and in determining the average effective mobility.

[Contact: (301) 921-3621]

Wilson, C.L. , and Russell, T.J. , TwoDimensional Modeling of Channel HotElectron Effects in Silicon MOSFETs,

to be published in the Technical

Digest, 1985 International Electron

Devices Meeting, Washington, DC, December 1-4, 1985.

Earlier models have successfully modeled

currents associated with device degradation due to channel hot electrons. In

this work, a high accuracy twodimensional model of a silicon MOSFET is

combined with a model of the SiO^-Si

interface which includes both (1 ) the

energy dependence of the interface traps

within the silicon bandgap and (2) the

positional dependence of the oxide

charge and the interface traps along the

channel of the transistor. This model

allows the effects of channel hot

electrons on the sub threshold, linear,

and saturation regions after injection

of the device to be modeled without

introducing free parameters.

[Contact: (301) 921-3621]

Recently Published

Wilson, C.L., Roitman, P. , and Blue,

J.L. , High Accuracy Physical Modeling

of Submicron MOSFETs, IEEE Transactions on Electron Devices, Vol. ED-32,

No. 7, pp. 1 246-1258 (July 1985).
Page 6 CEEE Technical Progress Bulletin - March 86

Process & Device Modeling / cont'd.

Using the data obtained from the mea- surements described in this work, it is

possible to model the drain current for

all of the transistors studied with no adjustable parameters. Transistors with

0.81 -pm channel length differ in model

input from those with 8.17-ym channel

length only in the length of the polysilicon gate. The accuracy of the simulation is maintained over the subthreshold, triode, and saturation regions and

is comparable for all channel lengths.

[Contact: (301) 921-3621]

Packaging

Released for Publication

Harman, G.G. , Acoustic-Emission Tests

for Microelectronic Tape Automated

Bonding (TAB), to be published in the

ASNT (American Society for Nondestructive Testing) Nondestructive Testing

Handbook, Vol. 5, Acoustic Emission

Testing.

An acoustic-emission (AE) test method

and equipment for tape automated bonding

(TAB) integrity have been developed.

The system consists of a precision testing machine that simultaneously applies

a clamping force on the semiconductor

chip and a lifting force on the electrical interconnecting leads. Acousticemission signals are transmitted through

a waveguide to the detector. The system

also permanently forms (raises) the

leads, which is a normal requirement for

TAB devices. Large acoustic-emission

signals occur when a lead breaks, a bump

lifts, or a weld crack propagates.

Appropriate AE signal processing is also

discussed.

[Contact: (301) 921-3625]

Harman, G.G. , An AE-Monitored Thermal

Shock Test for Hybrid Microcircuit

Packages, to be published in the ASNT

(American Society for Nondestructive

Testing) Nondestructive Testing

Handbook, Vol. 5, Acoustic Emission

Testing.

An acoustic-emission-monitored test for

hybrid microcircuit package integrity

was developed. It consists of a hot

stage operating at 400°C, a special

water-cooled acoustic- emission detector

mount, and appropriate signal recording

equipment. In use, the detector is

coupled to the back of a hybrid package

and both are set on the hot stage for

approximately 30 s. Any acousticemission signals indicate thermal excur- sion damage to the glass-metal seals.

The acoustic-emission signals were cor- related with both room temperature and

125°C leak tests of the packages.

[Contact: (301 ) 921-3625]

Recently Published

Oettinger, F.F., Thermal Measurements

of VLSI Packages - A Critical Overview, in book. Abstracts of the

I EEE/NBS VLSI Packaging Workshop,

Gaithersburg, Maryland, September 9-11,

1985, pp. 26-29.

Techniques to thermally characterize

ceramic and plastic VLSI packages are

discussed. Computer simulations and

both direct and indirect thermal evaluation techniques are highlighted. Limitations and strengths of the various

techniques are identified.

[Contact: (301) 921-3541]

Other Semiconductor Metrology

Released for Publication

Stern, E.A., Ma, Y. , and Bouldin, C.E.,

The Local Structure at Mn Sites in

Icosahedral Mn-Al Quasicrystals.

Extended x-ray absorption fine structure

(EXAFS) measurements have been made at

the Mn K-edge of quasicrystalline and

crystalline forms of an Al

f Mn alloy.

Two different quasicrystalline Mn sites are discerned to be populated in the

ratio of t within experimental error. The more populous site is similar to

that in the crystal but with bond angle

distortions and elimination of an unusually short Al-Mn bond, while the
CEEE Technical Progress Bulletin - March 86 Page 7

Other Semiconductor Metrology , cont'd.

other site has additional bond

stretching distortions. The EXAFS

measurements together with density

measurements indicate that the volume

per Mn-site is independent of type of

site, suggesting that the quasicrystal

is not a Penrose lattice.

[Contact: Charles E. Bouldin (301)

921-3786]

FAST SIGNAL ACQUISITION, PROCESSING,

AND TRANSMISSION

Waveform Metrology

Released for Publication

Bell, B.A., Editor, Proceedings of the

Seminar on Digital Methods in Waveform

Metrology, to be published as NBS

Special Publication 707.

Modern electronic instrumentation me- trology in the low-frequency regime

(dc-10 MHz) was discussed in lecture

talks and papers presented at NBS,

Gaithersburg, MD, on October 18-19,

1 983. The seminar program was organized

into four main session topics, as outlined in the Seminar Agenda.

This special publication contains com- plete papers on the subjects presented

at the seminar, providing more of the

technical details. For the sessions on Precision Waveform Synthesis, Precision

Waveform Sampling, and Data Converter

Characterization, six formal papers are given describing the hardware and software techniques used for developing NBS

laboratory standards and apparatus for

testing ac sources and voltmeters, phase

angle meters, transient waveform re- corders, wideband wattmeters, and

digi tal- to-analog and analog- to-digital

converters. For the informal session on Instrumentation Metrology, three subsequent papers have been written for publication which are included for com- pleteness in the Appendices.

[Contact: (301) 921-2727]

Laug, O.B., Stenbakken, G.N. , and Leedy,

T . F. , Electrical Performance Tests

for Audio Distortion Analyzers, to be

published as NBSIR 85-3269.

Electrical performance test procedures

for audio distortion analyzers were

developed by the National Bureau of

Standards for the U.S. Army Communications-Electronics Command. The report

provides detailed, step-by-step test

procedures that are based on specifications supplied by the Army for purposes

of evaluating audio distortion analyzer

bid samples. Examples of data sheets

and tables are also provided for recording interim and final results.

Ihe report discusses the philosophy of

each measurement procedure with a view

toward providing an understanding of the

basic metrology required to perform the

measurements. In addition, the sources

of measurement error are discussed. The

primary applications and basic principles of modern audio distortion ana- lyzers are also presented.

[Contact: (301) 921-2727]

Nahman, N.S., Software Correction of

Measured Pulse Data, to be published

in the Proceedings at the NATO Advanced

Study Institute, Cas telvecchio, Lucca,

Italy, July 9-23, 1983.

The fundamental concern in the software

correction of measured pulse waveform

data is the solution of an ill-posed

deconvolution problem which arises when

one (or both) of the known waveforms is

(are) corrupted by errors due to interference, noise, instrumentation drift,

etc. The variables concerned are re- lated to each other by the convolution

integral. When one of the integrand

functions is unknown while the other two

functions are known, the convolution

equation becomes an integral eauation

for the unknown waveform. Solution of an ill- posed deconvolution problem is

obtained by signal processing or filtering and at most yields an estimate for

the unknown waveform. The objective of

this discussion is to bring out the
Page 8 CEEE Technical Progress Bulletin - March 86

Waveform Metrology , cont' d.

ideas of i 11-posedness and to give exam- ples of applications to pulse measurement problems which require deconvolution, i.e. , the removal (correction) of

pulse source effects and/or measurement

system effects as encountered in signal

pulse waveform measurements and system

impulse response measurements.

[Contact: (303) 497-5167]

Souders, T.M., and Stenbakken, G.N. , Modeling and Test Point Selection for

Data Converter Testing, to be published in the Proceedings of the 1985

IEEE International Test Conference,

Philadelphia, Pennsylvania, November

1 8-22, 1985.

Methods for generating efficient testing

strategies for data converters are presented. Linear modeling techniques

based on circuit analysis and empirical

test data are included, as well as algorithms for selecting optimal test

points. Using these tools, converter

errors can be accurately estimated for

all code states from a relatively small

number of measurements.

[Contact: (301) 921-2727]

Stenbakken, G.N. , Souders, T.M., Lechner, J. A., and Boggs, P.T. , Efficient;

Calibration Strategies for Linear, Time

Invariant Systems, to be published in

the Proceedings of Autotestcon '85,

IEEE International Automatic Testing

Conference, Uniondale, New York,

October 22-24, 1985.

An efficient strategy for accurately

characterizing the frequency response of

linear, time invariant systems is presented. The approach, based on circuit

modeling, test point selection, and

parameter estimation, optimizes calibration confidence with respect to test

effort. The analytic tools and methodology needed for designing the strategy are included, together with experimental results. The approach can be

particularly beneficial in volume testing of devices such as amplifiers, attenuators and filters, or systems whose

frequency response is dominated by such

devices.

[Contact: (301 ) 921-2727]

Recently Published

Gans, W.L. , Picosecond Pulse Measurements at NBS, Proceedings of the IEEE

Instrumentation and Measurement Technology Conference, Tampa, Florida,

March 20-22, 1985, pp. 142-144.

The primary system used at NBS, Boulder

to measure fast (picosecond to nanosec- ond regime), repetitive, electrical

pulse parameters consists essentially of

a wideband (dc-18 GHz) sampling oscilloscope interfaced to a minicomputer.

This paper describes the techniques

employed at NBS to reduce the effects of

two major sources of pulse measurement

error. These two sources are the distortions caused by the sampling head

circuitry and by sample timing jitter.

The techniques employed are based on the

deconvolution methods of Tikhonov.

[Contact: (303) 497-3538]

Kuffel, J. , Malewski, R., van Heeswijk,

R. , and Lawton, R.A., Dynamic Performance of Digital Recorders Used for

Monitoring High Voltage Impulse Tests,

Proceedings of the IEEE Instrumentation

and Measurement Technology Conference,

Tampa, Florida, March 20-22, 1985, pp.

211-215.

Frequency and time domain characteristics of digital transient recorders (in

short, digitizers) are discussed in

order to establish the requirements on digitizers used for high voltaqe testing. Results of an experimental study

performed on a 200-MHz, 8-bit diqitizer

(Tektronix 761 2D) are presented and

related to the design features of tha;*

instrument. The inherent design characteristics and their influence on the

digitizer dynamic performance are ana- lyzed in view of simulation of the diqitizer through a computer model.

[Contact: Robert A. Lawton (303) 497-

3339]
CEEE Technical Progress Bulletin - March 86 Page 9

Waveform Metrology , cont'd.

Larsen, N.T. , Vecchia, D. F. , and Sugar,

G.R., VOR Calibration Services, NBS

Technical Note 1069 (April 1985).

The National Bureau of Standards has

designed, constructed, and evaluated a standard for the support of very-highfrequency omnidirectional range (VOR)

air navigation aids. The standard con- sists of two instruments: (1 ) a digital

waveform signal generator for the com- posite VOR audio waveform, and (2) a standard phasemeter based on time series

analysis of this waveform. Experimental

results, a statistical analysis of them,

and the listings of principal software

are included.

[Contact: (303) 497-371 1]

Lawton, R.A., Pulse Waveform Standards

for Electro-Optics, Picosecond Electronics and Optoelectronics, Proceedings of the Topical Meeting, Lake

Tahoe, Nevada, March 1 3-15, 1985, G.A.

Mourou, D.M. Bloom and C.-H. Lee, Eds.,

( Springer-Verlag, Berlin), pp. 205-206.

This paper describes the development of

reference waveform generators for transfer of NBS pulse measurement accuracy to an emerging class of electro-optic sam- plers having picosecond and subpicosecond time-resolution capabilities. A

comb generator appears to be a promising

candidate: it is commercially available

and physically compact, it exhibits good

signal- to-noise ratio, and the waveform

duration covering the most significant

parts of the waveform is commensurate

with one scan of the sampler used.

[Contact: (303) 497-3339]

Lawton, R.A., Status Report: Transient Waveform Recorder Standard,

Proceedings of the IEEE Instrumentation

and Measurement Technology Conference,

Tampa, Florida, March 20-22, 1985, pp.

1 54-1 55.

The origin and activities of the Waveform Measurement and Analysis Technical

Committee of the Instrumentation and

Measurement Society of the IEEE are described. Responding to the recent

availability of several digital waveform

recorders, the committee is developing a performance standard for waveform re- corders. The participants on the com- mittee are identified, and the current

state of development of a draft standard

is given.

[Contact: (303) 497-3339]

Leedy, T.F., and Bell, B.A., Automatic

Test Equipment Calibration/Performance

Verification Evaluation and Research

Program (JLC/DoD Subtask 30702),

NBSIR 84-2978 (December 1984).

This work describes an experimental

approach to verify the performance of

selected third-generation automatic test

systems. As part of an ongoing project,

this work builds on previous research in

methods to characterize the accuracy of

test systems measuring ac and dc voltages. This report describes the methods

used to characterize an ac voltage

source covering a voltage range of approximately 225 mV to 2.8 V rms over a frequency range of 50 kHz to 10 MHz. In

addition, the characterization of a precision phase angle generator, designed and built at NBS, is described.

Finally, the measurement results obtained with an automatic test system,

using a new software operating system

and the ac, dc, and phase angle transport standards, are discussed in detail.

[Contact: (301 ) 921-2727]

Cryoelectronic Metrology

Released for Publication

Hamilton, C.A., Kautz, R.L. , Steiner,

R.L. , and Lloyd, F.L. , A Practical

Josephson Voltage Standard at One

Volt.

A series array of 1484 pairs of Josephson junctions biased by microwaves at 72

GHz is demonstrated to provide stable

quantized voltages at the 1 volt level.

[Contact: (303) 497-3740]
Page 1 0 CEEE Technical Progress Bulletin - March 86

Cryoelectronic Metrology , cont'd.

Recently Published

Hamilton, C.A., Lloyd, F.L. , and Kautz,

R.L. , Superconducting A/D Converter

Using Latching Comparators, IEEE

Transactions on Magnetics, Vol. MAG-21,

No. 2, pp. 197-199 (March 1985). [Proceedings of Applied Superconductivity

Conference, San Diego, California,

September 9-13, 1984]

This paper describes the design and

performance of a six-bit analog-todigital (A/D) converter using fast edge

latching comparators. Simulations predicting conversion times of 100 ps and

1 00-MHz signal bandwidth are verified

experimentally. The addition of a su- perconducting track/hold circuit in

front of the A/D converter is expected

to substantially improve the signal

bandwidth.

[Contact: (303) 497-3740]

Kautz, R.L. , Chaos and Thermal Noise

in the RF-Biased Josephson Junction,

J. Applied Physics, Vol. 58, No. 1, pp.

424-440 (1 July 1985).

The effect of thermal noise on chaotic

behavior in the rf-biased Josephson

junction is studied through digital

simulations. In instances for which

chaotic behavior occurs in the noisefree system, it is found that the dynamics of the system are almost unchanged

by the addition of thermal noise unless

the level of thermal noise exceeds that

of the chaotic state. In instances for

which the only stable states of the

noise-free system are periodic solutions, small amounts of thermal noise

can induce the junction to hop between

two different dynamical states, producing a low-frequency noise level much

higher than that of the thermal noise.

Such noise-induced hopping can occur either between two periodic solutions or

between a periodic solution and a metastable chaotic solution. When a metastable chaotic state is involved, temperatures somewhat higher than those which

produce hopping can destabilize the

periodic solution to the point where the

system spends virtually all of its time

in the metastable chaotic state, creating noise-induced chaos. The similarities between chaotic behavior at zero temperature and noise-induced chaos are sufficiently strong that it may be difficult to distinguish the two cases experimentally.

[Contact: (303) 497-3391]

McDonald, D.G. , and Frederick, N.V. , Amplification by a Voltage Locked Array

of Josephson Junctions, Applied Physics Letters, Vol. 47, No. 5, pp. 530-

532 (1 September 1985).

We have studied a new type of Josephson

junction amplifier which is based on a two-junction array; the junctions are mutually phase locked at the Josephson

self -oscillation frequency. With this

frequency at 82 GHz, the voltages of the

junctions remain equal (locked) for a bias current range as large as 60% of

the critical current. Over a much

smaller bias range, with an applied

signal frequency of 1 kHz, a smallsignal power gain of 19 dB was measured,

accompanied by a negative resistance

input impedance. This performance is

consistent with a quasi-static theory of

the amplifier.

[Contact: (303) 497-51 1 3]

McGrath, W.R., Raisanen, A.V. , Richards,

P.L. , Harris, R.E., and Lloyd, F.L.,

Accurate Noise Measurements of Superconducting Quasiparticle Array Mixers,

IEEE Transactions on Magnetics, Vol.

MAG-21, No. 2, pp. 212-215 (March

1985). [Proceedings of Applied Superconductivity Conference, San Diego,

California, September 9-1 3, 1984)

We have constructed a 30-40 GHz test

apparatus which allcws us to measure the

noise temperatures of superconductorinsulator-superconductor (SIS) mixers

with an accuracy of better than 11 K. This is a factor of six improvement over earlier measurements. The most accurate

measurement made thus far of a mixer
CEEE Technical Progress Bulletin - March 86 Page 1

Cryoelectronic Metrology , cont'd.

which uses a single Pb-alloy junction

yielded TM

= 9.2 ± 0.9 K; and mixer

gain: CM = 0.240 ± 0.005. In addition, SIS mixers employing arrays of N =

1, 5, 10, 25, and 50 tunnel junctions in

series have been tested. The input

power required to saturate the array

mixers was found to increase as N

2 and

the gain and noise temperatures of the

array mixers were independent of N.

[Contact: Richard E. Harris (303) 497-

3776]

Muhlf elder, B., Beall, J. A., Cromar,

M.W., Ono, R.H. , and Johnson, W.W.,

Well Coupled, Low Noise, dc SQUIDS,

IEEE Transactions on Magnetics, Vol.

MAG-21, No. 2, pp. 427-429 (March

1985). [Proceedings of Applied Superconductivity Conference, San Diego,

California, September 9-1 3, 1984]

We have designed, fabricated, and tested

a Double Transformer (DT) coupled dc

SQUID (Superconducting Quantun Interference Device) with low noise, an input

inductance of 1 yH, and a smooth inputoutput characteristic. A transmission

line model is presented to explain a resonance in the input-output characteristic of early versions of this device.

Guided by the results of numerical simulations, a new version of this device

has been built and tested. Experimental

results are presented that shew that the

resonance can be moved to a higher voltage by reducing the area of the SQUID

loop. The voltage-external flux characteristic of some of these new devices

agrees to within 10% with computer simulations. The minimum detectable energy

per unit bandwidth ( MDE ) referred to the

SQUID loop is 1 0 h, where h is Planck's

constant. Computer simulations indicate

an MDE of 6 h.

[Contact: (303) 497-3597]

Ono, R.H. , Beall, J. A., and Harris,

R.E., Fabrication of a Miniaturized

DCL OR Gate, IEEE Transactions on Magnetics, Vol. MAG-21, No. 2, pp.

846-849 (March 1985). [Proceedings of

Applied Superconductivity Conference,

San Diego, California, September 9-13,

1 984]

Using niobium edge junctions and

electron-beam lithography ( EBL ) , we have

made direct-coupled-logic (DCL) OR gates

with 1-ym minimum linewidths. The gate

cell, containing an isolator and a buffer section, fits into an area of approximately 25 by 30 ym2 .

Our corrputer simulations show that these

gates can have switching times of less

than 10 ps. We have simulated the DCL

circuit with several values of the most

space-consuming element, an inductor.

This paper describes the results of

these simulations and presents a detailed description of the 7-level fabrication process. The mix of optical and

electron-beam lithography used relies

heavily on an inexpensive, yet powerful,

circuit layout program.

[Contact: (303) 497-3762]

Antenna Metrology

Released for Publication

Lewi s , R .L . , Spherical-Wave SourceScattering-Matrix Analysis of Coupled

Antennas; A General System Two-Port

Solution.

Expressions are given for the coupling

between two antennas in terms of each

antenna's sphe r i c a 1- wa ve sourcescattering matrix. A comparison with

the "classical" scattering matrix representation is given in sufficient detail

to permit conversion back and forth

between the source-scattering matrix and

the classical scattering matrix. The

paper concludes with expressions for the

transmission formulas, showing two different expressions corresponding to

reversing the direction of propagation.

However, if both antennas are reciprocal

with equal characteristic waveguide

impedances, then the two-port scattering

matrix is a symmetric matrix.

[Contact: (303) 497-5196]
Page 1

CEEE Technical Progress Bulletin - March 86

Antenna Metrology , cont'd.

Lewis, R»L. , and Wittmann, R.C., Improved Spherical and Hemispherical

Scanning Algorithms.

A probe-corrected spherical-scanning

algorithm has been developed which is

applicable when the antenna under test

radiates negligibly into its rear hemisphere. Compared to an efficient version

of the best previously published fullsphere scanning algorithm, it is found

that our hemispherical scanning algorithm is over three and a half times

more efficient. Improvements have also

been made to full-sphere scanning, with

the result that our new spherical scan- ning algorithm is twice as efficient as

the best previous full-sphere algorithm.

We also shew that our new formulations

constitute an exact inversion of the

band-limited spherical-coordinate representation of the received signal (i.e.

,

no aliasing errors are introduced) . [Contact: (303) 497-5196]

Newell, A.C., and Repjar, A.G. , Development ©£ Hear-Field Test Procedures

for Communication Satellite Antennas,

Phase Part 1 , to be published as NBSIR 65-3031.

The purpose of this program is to define

and further develop the capabilities of

near-field antenna test techniques,

specifically for the requirements asso- ciated with the development and verification testing of reconfigurable, multibeam, frequency reuse, commercial satellite antennas. Phase I, Part 1 gives a general survey, definition, and description of near-field and compact range

measurement methods as they apply to

satellite antenna systems testing. Each

of these methods is evaluated to determine how well it meets the measurement

requirements. Included for each technique is a summary of the measurement

method, discussions on probe correction

and data processing, measurement hardware considerations, a results-available

section, and measurement accuracy and

range certification considerations. The

basis for the choice of the best mea- surement technique is established with

the planar near-field measurement method

receiving the best score for the directive antennas considered. As a result,

further study will focus on this technique and will be reported on subsequently. A detailed presentation of

planar near-field measurements theory is

presented in Appendix A.

[Contact: (303) 497-3743]

Recently Published

Hill, D.A., Out-of-Band Response of

Reflector Antennas, NBSIR 85-3021

(April 1985) .

The response of reflector antennas to

out-of-band frequencies has been ana- lyzed using physical optics. A simple

approximate expression has been obtained

for the effective aperture, and this

egression yields both the receiving

pattern and the frequency dependence on

the on-axis gain. The theory has been

compared with published out-of-band

measurements, and the pattern agreement

is good, but the measured gain falls

below the theory. This discrepancy is

caused by mismatch loss in the coax-towaveguide adapter.

[Contact: (303) 497-3472]

Hill, D.A., and Koepke, G. H. , A NearField Array of Yagi-Oda Antennas for

Electromagnetic Susceptibility Testing, NBS Technical Note 1082 (July

1985) .

In electromagnetic susceptibility testing of electronic equipment, the ideal

incident field is a plane wave. To

approximate this condition, a seven- element array of Yagi-Uda antennas has

been constructed and tested at a frequency of 500 MHz. The element weightings are determined by a near-field

synthesis technique which optimizes th»' uniformity of the field throughout a rectangular test volume in the near field of the array. The amplitude and

phase of the electric field have been

measured throughout the test volume wi •
CEEE Technical Progress Bulletin - March 86 Page 1

3

Antenna Metrology , cont'd.

a short dipole probe, and the agreement

with the theory is excellent.

[Contact: (303) 497-3472]

Muth, L. A., A Theory of Mutual Impedances and Multiple Reflections in an

N-Element Array Environment, NBS

Technical Note 1078 (February 1985).

A general theoretical approach is formulated to describe the complex electromagnetic environment of an N-element

array. The theory reveals the elementto-element interactions and multiple

reflections within the array. From the

formulation, it is found that the interaction between an excited element and an

open-circuited element can be viewed as the sum of terms describing all possible

signal paths within the array environment which start from the radiating

element and terminate on the element

under observation. Within all paths

except the most direct one, multiple

reflections between subgroups of elements take place. The resulting solution is highly structured and recursive

and is discussed in detail in the text.

Illustrative examples are provided to

facilitate understanding of these

ideas.

[Contact: (303) 497-3603]

Wyss, J.C., and Sheeran, S.T., A Practical Optical Modulator and Link for

Antennas, J. Lightwave Technology,

Vol. LT-3, No. 2, pp. 316-321 (April

1 985) .

This paper describes a practical application of a technique for coupling an antenna to a receiver using a passive

fiber-optic link. This technique should

avoid pickup and electromagnetic perturbations normally associated with the use

of electrically conductive cables.

Laser light (632.8 nm) is modulated at

the antenna by an electrooptic lithiumtantalate crystal and is then transmitted with a fiber-optic cable to the

receiver electronics. Using an ava- lanche photodiode, the amplitudemodulated optical signal is converted to

an electrical signal. The crystal is

mounted directly on an antenna without

amplifiers or other electrically powered

components. Using a broad-band antenna

with fields generated in an anechoic

chamber and a standard TEM cell, the

frequency response as measured dropped 3

dB per 1.0 GHz from 100 MHz to at least

2.0 GHz, with a signal- to-noise ratio of

5 dB with a 1.0-V/m field and a 1 . 0-kHz

bandwidth. A dynamic range of at least

60 dB is shown.

[Contact: Charles K. S. Miller (303)

497-31 31]

Noise Metrology

Recently Published

Daywitt, W.C., A Derivation for the

Noise Temperature of a Horn-Type Noise

Standard, Metrologia, Vol. 21, pp.

127-1 33 (1985) [previously published

as Appendix A, NBS Technical Note 1071,

December 1983].

Noise sources consisting of an electromagnetic horn aimed at an absorbing

material have been in use for many

years. A satisfactory derivation of the

noise temperature for such a configuration has been missing, however, preventing the use of this horn-type noise

source as a primary reference standard.

The derivation described in this paper

models the various noise emitters within

the source well enough to provide an accurate estimate of the noise temperature and a complete error analysis.

[Contact: (303) 497-3720]

Daywitt, W.C., Broadband Noise Source

Applications, Proceedings of the IEEE

Instrumentation and Measurement Technology Conference, Thmpa, Florida,

March 20-22, 1985, pp. 165-166.

Accurate noise characterization of am- plifiers and communication systems re- quires the use of thermal noise standards. This note is a brief review of

the use of such standards as a basis for

the measurement of effective input noise
Page 1

CEEE Technical Progress Bulletin - March 86

Noise Metrology / cont'd.

temperature and the G/T of a satellite

earth terminal receiving system.

[Contact: (303) 497-3720]

Perera, S. , Noise Temperature Measurements at tine National Bureau of Standards, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Tampa, Florida, March

20-22, 1985, pp. 159-1 60.

Thermal noise presents the ultimate

limitation in the reception and detection of low-level electromagnetic signals. This paper briefly reviews the

physics of thermal noise, devices that

generate noise, and measurement methods

to characterize noise sources.

[Contact: (303) 497-3546]

Reeve, G.R. , and Miller, C.K.S., Current MBS Metrology Capabilities and

Limitations at Millimeter Wave Frequencies, Proceedings of the 1985 Measurement Science Conference, Santa

Clara, California, January 17-18, 1985,

pp. 296-314.

The National Bureau of Standards (NBS)

establishes national artifact standards

and provides a metrology base for U. S.

industry and technology. In the millimeter wave frequency spectrum, NBS has

not established all of the required

metrology to meet the needs of industry

or government for this technology. It

is the intent of this paper to describe

the technical demands of responding to

the challenges of millimeter-wave technology. A description of the current

capabilities that exist at NBS is given

for those parameters and frequencies

where measurement services exist. Where

novel standards have been developed,

such as the 94-GHz thermal noise standard, the physical basis for the standard is described to indicate the

changes from lower frequency designs and

the challenges that had to be overcome. Limitations in services and in concepts

of standards for providing those ser- vices are described to indicate the

degree of research that must be undertaken to satisfy future industrial needs

in this evolving technology.

[Contact: (303) 497-3557]

Microwave Metrology

Released for Publication

Wilson, P. F., and Chang, D.C., Mode

Coupling by a Longitudinal Slot for a Class of Planar Waveguiding Structures:

Part I - Theory, Part II - Applications.

Coupling between two parallel-plate

waveguides is investigated. Mutual

excitation is due to a longitudinal slot

in a common plate. The introduction of

reflecting boundaries parallel to the

slot allows one to model a number of

planar waveguiding structures featuring

a common coupling mechanism. Part I of

this paper details the analysis of the

basic slot scattering problem based on

the singular integral equation method.

If one assumes that the slot is small,

then closed-form algebraic modal equations follow. These modal equations are well adapted to numerical parametric

studies.

Part II of this paper presents specific

examples of the above approach along

with numerical results. Examples include a rectangular coaxial transmission

line, broadwa 11-coupled rectangular

waveguides, coupled microstrips, and

coupled microstrip and rectangular waveguide.

[Contact: (303) 497-3842]

Recently Published

Holt, D.R., and Hoer, C.A., Estimation

of True Power Ratios in Six-Port Network Analysers Using Diode De tec tor8

,

Proceedings of the IEEE Instrumentation

and Measurement Technology Conference,

Tampa, Florida, March 20-22, 1985, pp.

1 40-141.

A model for detector nonlinearity is

included in the determination of six-
CEEE Technical Progress Bulletin - March 86 Page 1

Optical Fiber Metrology / cont'd.

A method using mode transfer matrices to

characterize step index fiber components

and predict Local Area Network (LAN)

power budget is presented. The results

show this method is well adapted to

describing modal power distribution

variations.

[Contact: Robert L. Gallawa (303) 497-

3761]

Shao, Y. , Alvarez, R., Weimer, C., and

Gallawa, R.L. , Pulse Spectrum Analysis Method Measuring Fiber Bandwidth,

to be published in Proc. SPIE - The

International Society for Optical Engineering, 559 [Conference, San Diego,

CA, August 18-23, 1985].

A system for measuring optical fiber

bandwidth utilizing the Pulse Spectrum

Analysis method (PSA) has been established. This paper will discuss problems inherent to that system such as signal- to-noise ratio and off-peak error. Included are the results of bandwidth measurements for telecommunication

grade fibers. Finally, the PSA method

is compared to other bandwidth measurement methods.

[Contact: Robert L. Gallawa (303)

497-3761]

Shao, Y. , and Gallawa, R.L. , A Comparison of Three Bandwidth Measurements

Techniques for Optical Fibers.

This paper presents the results of an experiment to compare three distinct

methods ot measuring the bandwidth of a telecommunication grade, multimode optical fiber. The three methods are 1) the

time-domain method, 2) the frequencydomain method, and 3) the pulse spectrum

analysis method. We find good agreement

between the frequency-domain method and

the pulse spectrum analysis method, but

the time-domain method yields results

that are lower than the other two for

the cases we considered.

[Contact: Robert L. Gallawa (303)

497-3761]

Recently Published

Rodhe, P. M., Intramodal Part of the

Transfer Function for an Optical Fiber,

J. Lightwave Technology, Vol. LT-13,

No. 1, pp. 154-158 (February 1985).

Intramodal contributions in measurements

of optical fiber bandwidth are investigated theoretically and experimentally

in the quasimonochroma tic case. A relation is established between the intramodal transfer function and a possibly

non-Gaussian source spectrum, which may

also vary with modulation frequency. By

considering the latter variation in

particular, we are able to predict the

intramodal length dependence and show

how it may deviate from that of a con- ventional approach.

[Contact: Aaron A. Sanders (303)

497-5341]

Other Fast Signal Topics

Released for Publication

Gibson, K. A., and Miller, C.K.S., A

Bibliography of the NBS Electromagnetic

Fields Division Publications, to be

published as NBSIR 85-3022.

This bibliography lists the publications

of the personnel of the NBS Electromagnetic Fields Division in the period from

January 1982 through December 1983.

[Contact: (303) 497-31 32]

Hill, D.A., Electromagnetic Wave Propagation in an Asymmetrical Coal Seam.

Electromagnetic wave propagation in

a coal seam is analyzed for the case

where the surrounding floor and roof

rocks have different electrical properties. Numerical results are presented

for the attenuation rate and field distribution of the dominant mode. The

results have application to mine communication and remote sensing of coal

seams

[Contact: (303) 497-3472]
Page 1

8

CEEE Technical Progress Bulletin - March 86

Other Fast Signal Topics , cont'd.

Judish, R.M. , Quality Control of Measurements - Measurement Assurance,

to be published in the forthcoming

special issue of the Proceedings of the

IEEE on Radio Measurement Methods and

Standards

The ability to relate individual mea- surements to nationally accepted standards is a requirement of traceability.

This paper discusses a perspective in

which the goals of traceability are viewed in terms of performance requirements on the quality of measurements as reflected in a statement of uncer- tainty.

[Contact: (303) 497-3380]

Recently Published

Katzir, Y. , Young, M. , and Glaser, I.,

Pattern Recognition Using Incoherent

OTF Synthesis and Edge Enhancement,

Applied Optics, Vol. 24, No. 6, pp.

863-867 (1 5 March 1985).

This paper describes a system for pattern recognition using an incoherentoptical correlator. The system uses optical transfer function synthesis to

perform correlations with an edgeenhanced image of the object or pattern

being sought. The resulting correlations are free of bias and show good

discrimination between objects. In

addition, the difficult or timeconsuming conputations are performed

before the operation of the system; this

reduces the amount of postprocessing by

computer and should allow real-time

operation at video rates.

[Contact: Matt Young (303) 497-3223]

Kline, K.E., and DeWeese, M.E., Metrology for Electromagnetic Technology:

A Bibliography of MBS Publications,

NBSIR 85-3029 (July 1985).

This bibliography lists the publications

of the personnel of the Electromagnetic

Technology Division of NBS in the period

from January 1970 through December 1984.

A few earlier references that are directly related to the present work of

the Division are included.

[Contact: (303) 497-3678]

Major, J.R., Livingston, E.M., and

Adair, R.T. , Automatic Frequency

Response of Frequency-Modulated Generators Using the Bessel Null Method,

24th ARFTG Conference Digest, Fall

1984, Columbia, MD, December 5-6, 1984,

pp. 1 31-1 53 (1 985). [An identical

invited paper will be published in the

Proceedings of the Test and Measurement

World Expo, San Jose, California, May

13-15, 1985.]

This paper describes a Bessel null technique to measure the frequency response

of a frequency-modulated rf carrier and

a program to automate frequency response

measurements of signal generators with

output frequencies from 0.450 to 2000

MHz. The measurements obtained using

this technique are more accurate than

those obtained by a highly trained technician using a manual system.

Automated measurement of this process is

desirable since the manual method is

subject to the following problems: (1

)

excessive time, (2) error in finding the

null, and (3) lack of assurance that the

null is the first Bessel null. Automated measurements can be performed

using a system controller, a spectrum

analyzer, a function generator, and a voltmeter (all of which are compatible

and controllable remotely).

The nonlinear relationship between modulating signal amplitude and the center

frequency amplitude of the carrier is a major obstacle to automated measurement.

This problem was solved by obtaining an approximate formula for this nonlinear

curve.

Assurance that the null found is the

first Bessel null is provided by the

analysis of the frequency response ot the signal generator under test an displayed on the spectrum analyzer.

[Contact: (303) 497-3149]
CEEE Technical Progress Bulletin - March 86 Page 1

5

Microwave Metrology , cont'd.

port parameters without using additional

standards. A computer simulation was performed assuming that the true power

into each six-port detector is related

to the power observed by the detector.

Simultaneous estimation of the six-port

and detector parameters is accomplished

through a nonlinear least-squares algorithm. Results of the simulation com- pare the reflection coefficient r com- puted from corrected power readings and

T calculated from observed power readings . [Contact: (303) 497-3574]

Juroshek, J.R., and Hoer, C.A., A

Technique for Extending the Dynamic

Range of the Dual Six-Port Network

Analyzer, IEEE Transactions on Microwave Theory and Techniques, Vol.

MTT-33, No. 6, pp. 453-459 (June

1 985) .

The dynamic range of the six-port type

of automatic network analyzer is typically limited to measuring two-port

devices with a transmission coefficient

S^

2 in the range of 0 to -60 dB. This

paper describes a subcarrier approach

for extending the dynamic range of the

dual six-port network analyzer. The

subcarrier is generated by inserting a

1 0-kHz , oiphase modulator ahead of one

of the six ports. With the subcarrier

approach, measurements of S

12 in the

range of -60 to -100 dB can be made.

Test results are presented shewing mea- surements of S 12 = “80 dB with a precision of ±0.05 dB or better, and an accuracy of ±0.16 dB or better at 3 GHz.

Measurement results are also presented

showing the dynamic range achievable

with thermistor and barretter detectors.

[Contact: (303) 497-5362]

Kanda, M., and Orr, R.D. , A RadioFrequency Power Delivery System: Procedures for Error Analysis and SelfCalibration, NBS Technical Note

1083 (August 1985).

An expression is developed for net power

delivered to a load in terms of the

indicated forward and reflected power

and the system S-parameters and reflection coefficients. The directional

coupler is treated as nonideal with

power reflections assumed between all

ports. The system itself is used to

evaluate the major S-parameter terms in

net power computation, and uncertainty

in the computer power is derived from

origins in the power meter readings and

incompletely known S-parameters.

[Contact: (303) 497-5320]

Reeve, G.R., and Miller, C.K.S., Current NBS Metrology Capabilities and

Limitations at Millimeter Wave Frequencies, Proceedings of the 1985 Measurement Science Conference, Santa

Clara, California, January 1 7-18, 1985,

pp. 296-314.

The National Bureau of Standards (NBS)

establishes national artifact standards

and provides a metrology base for U.S.

industry and technology. In the millimeter wave frequency spectrum, NBS has

not established all of the required

metrology to meet the needs of industry

or government for this technology. It

is the intent of this paper to describe

the technical demands of responding to

the challenges of mi 1 lime ter-wave technology. A description of the current

capabilities that exist at NBS is given

for those parameters and frequencies

where measurement services exist. Where

novel standards have been developed,

such as the 94-GHz thermal noise standard, the physical basis for the standard is described to indicate the

changes from lower frequency designs and

the challenges that had to be overcome. Limitations in services and in concepts

of standards for providing those ser- vices are described to indicate the

degree of research that must be undertaken to satisfy future industrial needs

in this evolving technology.

[Contact: (303) 497-3557]

Laser Metrology

Released for Publication
Page 1

6

CEEE Technical Progress Bulletin - March 86

Laser Metrology , cont'd.

Bennett, H.E., Milam, D. , Guenther,

A.H., and Newman, B.E., Laser Induced

Damage in Optical Materials: 1983,

to be published as NBS Special Publication 688.

The Fifteenth Annual Symposium on Optical Materials for High Power Lasers

(Boulder Damage Symposium) was held at

the National Bureau of Standards in

Boulder, Colorado, November 14-16, 1983.

The Symposium was held under the aus- pices of ASTM Committee F-1, Subcommittee on Laser Standards, with the joint

sponsorship of NBS, The Defense Advanced

Research Project Agency, the Department

of Energy, the Office of Naval Research,

and the Air Force Office of Scientific

Research. Approximately 200 scientists

attended the Symposium, including representatives of the United Kingdom,

France, Israel, and West Germany. Hie

Symposium was divided into sessions

concerning Materials and Measurements,

Mirrors and Surfaces, Thin Films, and

Fundamental Mechanisms. As in previous

years, the emphasis of the papers presented at the Symposium was directed

toward new frontiers and new developments. Particular emphasis was given to

materials for high power apparatus. The

wavelength range of prime interest was from ~0.6 uni to the uv region. Highlights included surface characterization, thin film-substrate boundaries,

and advances in fundamental laser-matter

threshold interactions and mechanisms.

The scaling of damage thresholds with

pulse duration, focal area, and wave- length was discussed in detail. Harold

E. Bennett of the Naval Weapons Center,

Arthur H. Guenther of the Air Force

Weapons Laboratory, David Milam of the

Lawrence Livermore National Laboratory,

ana Brian E. Newman of the Los Alamos

National Laboratory were co-chairmen of

the Symposium.

[Contact: Aaron A. Sanders (303) 497-

3535]

Franzen, D.L. , A Picosecond Light Source Tunable from 1.35

to 1.54 ym.

A rhodamine-6G dye laser is synchronously pumped by a doubled, cw, mode-locked

NdrYAG laser. Pulses from the dye laser

are mixed in a LilOg crystal with

1.06-um pulses from the pump to produce

a difference frequency tunable from 1.35

to 1.54 ym. Average power, peak power,

and pulse width were approximately 4 u w / 12 mW, and 3 to 4 ps, respectively. Improvements in performance are discussed.

[Contact: (303) 497-3346]

Optical Fiber Metrology

Released for Publication

Day, G.W., McFadden, J.D.O., Veeser,

L.R., Chandler, G.I., end Cernosek,

R.W., Optical Fiber Sensors for the

Measurement of Pulsed Electric Currents, to be published in the Proceedings of the AGARD (NATO Advisory

Group for Aerospace Research and Development) Specialists Meeting on Optical

Guided Waves in the Military Environment, Istanbul, Turkey, September

23-27, 1985.

Recent progress in the design of fiber sensors for pulsed electric currents is

reviewed. Several of the most useful sensor configurations are described and

compared. Models are used to predict

the transfer function of these sensors,

their sensitivity to nonideal fiber

properties, particularly linear birefringence, and methods for overcoming

these problems. Other recent research

is examined to suggest the prospect for sensors with improved sensitivity and

stability.

[Contact: (303) 497-5204]

Maisonneuve, J. M., Churoux, P. , and

Gallawa, R.L. , Use of Mode Transfer

Matrices in LAN Loss Evaluation, to

be published in Proc. SPIE - The International Society for Optical Engineering, 559 [Conference, San Diego, Caliand Kanada, T. fornia, August 18-23, 1985].

,
CEEE Technical Progress Bulletin - March 86 Page 1

9

Other Fast Signal Topics , cont'd.

Reeve, G.R., and Miller, C.K.S., Current MBS Metrology Capabilities and

Limitations at Millimeter Wave Frequencies, Proceedings of the 1985 Measurement Science Conference, Santa

Clara, California, January 1 7-18, 1985,

pp. 296-314.

The National Bureau of Standards (NBS)

establishes national artifact standards

and provides a metrology base for U.S.

industry and technology. In the millimeter wave frequency spectrum, NBS has

not established all of the required

metrology to meet the needs of industry

or government for this technology. It

is the intent of this paper to describe

the technical demands of responding to

the challenges of mi 1 lime ter-wave technology. A description of the current

capabilities that exist at NBS is given

for those parameters and frequencies

where measurement services exist. Where

novel standards have been developed,

such as the 94-GHz thermal noise standard, the physical basis for the standard is described to indicate the

changes from lower frequency designs and

the challenges that had to be overcome. Limitations in services and in concepts

of standards for providing those ser- vices are described to indicate the

degree of research that must be undertaken to satisfy future industrial needs

in this evolving technology.

[Contact: (303) 497-3557]

Young, M., and Johnson, E.G. , Jr., Redefining the Scratch Standards, NBS

Technical Note 1080 (February 1985).

[Some of this material was presented in

a paper. Tunable Scratch Standards,

given at the conference of the International Society for Optical Engineering,

Measurement and Effects of Surface

Defects and Quality of Polish, Los

Angeles, CA, January 21-22, 1985, and

published in Proc. SPIE, Vol. 525, pp.

70-77, SPIE, P.0. Box 20, Bellingham,

WA 98227 (1985) .]

The scratch standard ( MIL-0-1 383QA ) is a

cosmetic standard that is effected by a visual comparison with a set of submasters that are in turn evaluated by com- parison with a set of master standards.

Both manufacture and certification of

the submasters are somewhat unreliable.

In this paper, we shew that the submasters can be classified according to the

relative power scattered at a relatively

small angle. We have designed etched

gratings with which to replace the submasters; these gratings have the appearance of scratches but diffract light

into a broad peak between 5 and 10 degrees off the axis of the incident beam.

We have classified some prototypes both

by comparison with the master standards

and by a photoelectric measurement;

agreement between the two methods is

good. We suggest that such gratings be

used as the submasters and possibly that

they be classified by a photoelectric,

rather than visual, measurement.

[Contact: (303) 497-3223]

Young, M. , Scratch Standards Should

not be Used to Predict Damage Threshold in Laser Induced Damage in Optical Materials: 1982, Proceedings of a Symposium, H.E. Bennett, A.H. Guenther,

D. Milam, and B.E. Newman, Eds., NBS

Special Publication 669 (January

1984) .

The scratch and dig standards are the

most widely used surface quality standards in the industry. In the Proceedings of the 1980 Symposium, H. Bennett

shewed theoretically that damage ought

to be initiated near a defect and re- lated damage threshold to defect size.

Evidently, because of one or both of

these considerations, some purchasers

may use the scratch standards to specify

the surface quality of components intended for high power laser systems.

Although damage is often associated with

the presence of a defect, this is an inappropriate use of these purely cos- metic standards; the classification of a particular scratch correlates only very

loosely with its width or depth. Even

if a component is made of glass, little

or nothing pertinent to damage threshold
Page 20 CEEE Technical Progress Bulletin - March 86

Other Fast Signal Topics / cont'd.

may be determined by classifying a scratch according to the cosmetic standard.

[Contact: (303) 497-3223]

Young, M., The Scratch Standard Is

Not a Performance Standard,

Proceedings of the Optical Fabrication

and Testing Workshop, Cherry Hill, New

Jersey, June 1 2-1 3, 1985, pp. ThAA4-1

and 2.

A history and description of the scratch

standard is presented, showing that the

scratch number should never be related

to its width and that the standard is

cosmetic only.

[Contact: (303) 497-3223]

Young, M. , The Scratch Standard Is

Only a Cosmetic Standard, Laser

Focus/ Electro-Optics.

A history of the scratch and dig standard is presented, describing its application and pointing out that it may not

be used for quantitative assessments

such as width measurement.

[Contact: (303) 497-3223]

ELECTRICAL SYSTEMS

Power Systems Metrology

Released for Publication

Fitzpatrick, G.J., Forster, E.O.,

Kelley, E.F., and Hebner, R.E.,

Streamer Initiation in Liquid Hydrocarbons, to be published in the Conference Record, 1985 Conference on Electrical Insulation and Dielectric

Phenomena, Buffalo, New York, October

21-24, 1985.

Using 93X magnification and a framing

rate of 2 x 1 0

7 frames/s, the initiation

of prebreakdown streamers in toluene,

isooctane, and a white oil have been

photographed. The initial growth from a negative point electrode was a thin

pencil- like structure, having a growth

rate of 2 to 3 x lO 1* cm/s, which subsequently branched into a tree-like structure. Positive streamers were found to

develop into a more filamentary structure than negative streamers. Under

nominally identical conditions, a positive streamer may grow, then disappear;

may grow to bridge the gap; or may grow

to a certain length, then persist.

[Contact: (301) 921-3121]

Me Knight, R.H. , Measurement of Electric Field and Ion-Related Quantities, to be published as a chapter in

the CRC Handbook on Air Ions.

Measurements of various quantities to

describe the electrical characteristics

of the atmosphere have been made for

many decades by atmospheric scientists

using a variety of instruments and

measurement techniques. This chapter

describes, with text and figures, those

techniques which have application in

present day ion-related research.

Topics covered include definitions of

terms; measurements of electric field,

space potential, vertical current

density, conductivity, net space-charge

density, unipolar ion density, and ion

mobility; species identification; errors associated with external electric fields

and off-ground operation of instruments,

and applications of measurements (2 3 figures, 101 literature references).

[Contact: (301) 921-3121]

Van Brunt, R.J. , Water Vapor-Enhanced

Electron Avalanche Growth in SP6 for

Nonuniform Fields.

When trace water vapor content is increased from 10 to 100 parts per million

by volume in SF

& at pressures from 200

to 300 kPa, a dramatic enhancement oc- curs in the mean size of electron ava- lanches formed near a positive point

electrode. Although this effect can b«- attributed to a change in gas composition, it is not due to a change in the

ionization rate for the gas. It is

proposed that the avalanche enhancement

is due primarily to an increase in the

probability for initiating electron
CEEE Technical Progress Bulletin - March 86 Page 21

Power Systems Metrology , cont'd.

release from minor negative ions associated with water vapor that collisionally

detach more readily at a given field

strength than the predominant negative

ions associated with SF^. The profiles

of the electron avalanche size distributions exhibit a monotonic decrease of

probability with increasing number of

electrons for avalanches with fewer than

1

0

7 electrons, but pronounced peaks

appear in the distributions as the mean

electron number exceeds 107. These

peaks are not consistent with the behavior expected from a stochastic model of

electron avalanche growth in nonuniform

electric fields which neglects the influence of space charge.

[Contact: (301) 921-3121]

Recently Published

Misakian, M. , High Voltage Divider and

Resistor Calibrations, NBS Technical

Note 1 215 (July 1985)

An NBS calibration service for determining the ratio of high voltage dc dividers and the resistance of high voltage

resistors is described. Calibrations

are performed with a Wheatstone bridge

apparatus with a simple guard system.

Sources of systematic error are identified and methods for characterizing the

NBS standard high voltage resistors are

discussed. Ratio and resistance values

can be determined between the voltages

of 1 0 kV and 150 kV with an uncertainty

of less than ±0.01%.

[Contact: (301) 921-3121]

Petersons, 0., and Mehta, S.P. , Calibration of Test Systems for Measuring

Power Losses of Transformers, NBS

Technical Note 1204 (August 1985).

A calibration system for accuracy verification and alignment of test systems

for measuring transformer losses is

described. Methodologies are presented

for assessing measurement uncertainties

and tor evaluating overall accuracy of

test systems. Procedures are suggested

for continuing maintenance and calibration of standard instruments and test

systems to ensure traceable measurements.

[Contact: (301) 921-2328]

Ramboz, J.D., and Petersons, 0. , Emerging New Requirements for Electric

Power and Energy Measurements, Proceedings of the 1985 Workshop and Symposium of the National Conference of

Standards Laboratories, Boulder, Colorado, July 15-18, 1985, pp. 3-12.

Advances in electronic instrumentation

technology have brought greater stability and precision to transducers that

are utilized for measuring electric

power and energy. An advantage of instruments based on electronic transducers is that they can be readily

adapted to the measurement of other

quantities such as current, voltage,

reactive and apparent power, power factor, demand, time-of-day readings, etc.

The increases in the cost of energy

during the past decade have stimulated

the acceptance of new instrument technology by the users associated with the

electric power industry. The electronic

instruments have especially found acceptance in metering installations for

large loads and at interchange points

between utilities. Modern instruments,

because of their accuracy capabilities,

are also advantageous in those applications where the efficiency of large

equipment such as generators and transformers has to be measured. A large

number of instruments used as physical

standards by the industry and submitted

recently to the National Bureau of Standards (NBS) for calibration have been of

the electronic type. The calibration

accuracies requested from NBS for power

and energy measurements have increased

at least fivefold (uncertainty reduction

from ±0.05% to ±0.01%) within the past

several years. Calibrations for different quantities and values are being

requested. These changing calibration

requirements and the response of NBS to

meet the requests of its calibration

clientele are discussed.

[Contact: (301) 921-31 21]
Page 22 CEEE Technical Progress Bulletin - March 86

Power Systems Metrology , cont' d.

Schwitz, W., Kampfer, R. , Braun, A.,

Souders, T.M., Moore, Cassidy,

B.R., and Deacon, T.A., International

Comparison of Current Transformer Calibrations, IEEE Transactions on Instrumentation and Measurement, Vol.

IM-34, No. 2, pp. 234-238 (June 1985).

An international coirparison of current

transformer calibrations among five

metrology laboratories has been con- ducted. The measurements were made at

current ratios ranging from 1 A:1 A to

200 A:1 A at 1 0, 100, and 200 percent of

rated current and from 5 A:5 A to

200 A:5 A at 1 , 10, 100, and 200 percent

of rated current, at a frequency of 50

Hz. Several ratios have also been

compared at 60 Hz.

[Contact: T. Michael Souders (301)

921-2727]

Siddagangappa, M.C., and Van Brunt,

R.J., Decomposition Products from

Corona in SFg/N2 and SFg/02 Mixtures,

Proceedings of the Eighth International

Conference on Gas Discharges and Their

Applications, Oxford, England, September 16-20, 1985, pp. 247-250.

Absolute concentrations of S0F1+ , S0F

2

, S0

2 F

2

, SO^ , NO, N

2 0, and H20 produced

from continuous, dc, point-plane negative corona at a current of 40 A were

measured in SFg/N

2 and SFg/0

2 mixtures

containing trace amounts of H

2 0 and 1 to

95% N

2 or 1 to 1 0% 02 for a total gas

pressure of 200 kPa (~2 atm). The absolute and SFg-normalized charge rates-ofproduction for these by-products have

been determined as a function of N

2 or

C> 2 content. The results are interpreted

in terms of a model for electricdischarge-induced decomposition of SFg

discussed previously by Van Brunt. The

presence of N

2 accelerates the rate of

SFg decomposition by inhibiting the

recombination of SF, dissociation prodb ucts. At levels up to 10%, 0

2 actually

lowers the rates of oxyfluoride and S02 production due to its effect in reducing

the mean energy of electrons in the

discharge and thus the dissociation rate

of SFg

[Contact: Richard J. Van Brunt (301)

921-3121]

Pulse Power Metrology

Released for Publication

Hebner, R.E., High-Speed Data Systems

for Pulsed Power Applications, to be

published in the Proceedings of the 5th

IEEE Pulsed Power Conference, Washington, DC, June 10-12, 1985.

Data acquisition systems for pulse power

applications generally must provide

nanosecond resolution, operate in an environment of high levels of electromagnetic interference, and acquire significant amounts of data simultaneously.

To meet these demands, electrical systems have been used and optical systems are being introduced. Voluntary standards have been and are being developed

which categorize the errors in the

electrical measurement systems. Optical

systems are in too early a state of

development for similar standardization.

[Contact: (301) 921-3121]

Released for Publication

Dube, W.P., and Goodrich, L.F., A

Quench Detector Design for Superconductor Testing.

A quench detector is a device that interrupts the flew of current through a superconductor in the event the superconductor reverts to the normal, resistive state. This new design has adjustable filtering and sensitivity. The

input is well isolated from the output,

eliminating any possible ground loop

through the detector. It also has ex- cellent noise immunity.

[Contact: Loren F. Goodrich (303)

497-31 43]
CEEE Technical Progress Bulletin - March 86 Page 23

Superconduc tors , cont'd.

Fickett, F.R., and Capobianco, T.E.

,

Relationships Between Mechanical and

Magnetoelectric Properties of OxygenFree Copper at 4 K.

Commercially pure, oxygen-free copper is

the material of choice for nearly all

superconductor stabilization. It is

well known that straining relatively

pure copper at 4 K can result in significant increases in the residual resistivity and, thus, a decreased ability of

the copper to stabilize the superconductor. In this paper we quantify the

effect of strain on the resistivity and

magnetoresistivity of a large number of

oxygen-free coppers from various sources

and in various tempers and states of

reanneal. In addition, the detailed

low-temperature stress-strain behavior

of these materials and its correlation

with room temperature data and the re- sidual resistivity ratio (RRR) prior to

straining will be reported. An apparatus developed for mechanical properties testing of relatively small wire

samples at low temperature will be described.

[Contact: (303) 497-3785]

Goldfarb, R.B., and Clark, A.F., AC

Losses in Nb-Ti Measured by Magnetization and Complex Susceptibility.

DC magnetization and complex AC susceptibility were measured at 4 K as functions of longitudinal DC field for a multi filamentary Nb-Ti superconductor

with no transport current. Minor hysteresis loops were obtained in the dc

measurements. The full-penetration

field Hp, a function of applied field

H, was deduced directly for each minor

loop. The values for Hp were fit to

the Kim-type equation, Hp ( H ) = Hp ( 0 ) / ( 1 +H/Hk ) , where Hp ( 0 ) and

H k are constants. The minorhysteresis-loop areas gave losses that

were in excellent agreement with Carr's

theoretical critical-state equation, W =

( 4 y q H

Q Hp/ 3 ) (

1 -Hp/ 2H

Q

) , where H

Q is

the maximum applied field for each

loop.

An expression was obtained for the ideal

reversible differential susceptibility,

Xrev = <{) 0 /8 Try

0

( H-H c x ) X

2

, where

<J> 0 is the flux quantum, Hc ]^ is the

lower critical field, and X is the penetration depth. Hci and X for the

sample were deduced from the shape of

the major hysteresis loop. Clem's theoretical expressions for the real (y

1 ) and imaginary (y") components of AC

susceptibility are functions of AC field

amplitude h, Hp , and Xrev* The

predicted susceptibilities based on these expressions were in good agreement

with measured curves of y' and y" as functions of h and H. The measured y'

and y" were independent of frequency up

to 1 kHz, as expected when bulk hysteresis is the primary loss mechanism.

[Contact: (303) 497-3650]

Goodrich, L.F., IXibe, W.P. , Pittman,

E.S., and Clark, A.F., The Effect of

Aspect Ratio on Critical Current in

Multifilamentary Superconductors

Experimental data and discussion are presented on the critical current of

straight superconductors as a function

of the orientation of a perpendicular

applied magnetic field. Commercial,

multifilamentary NbTi and NbgSn samples

were measured in a radial access magnet

that allowed an arbitrary angle setting.

The change in critical current was measured at different magnetic fields to

scale the effect for use in a standard

test method. For a NbTi sample, the

critical current with the magnetic field

parallel to the wider face of the

conductor is higher than that with the

perpendicular orientation. The effect

can be as high as 40% for a NbTi sample

with an aspect ratio of 6. The effect

in NbgSn is opposite that in NbTi. A

discussion of the most likely cause of

the effect, which accounts for the

difference between NbTi and NbgSn, is

given.

[Contact: Clark (303) 497-3253]

Moreland, J. , Ekin, J.W., and Goodrich,

L.F., Electron Tunneling into Superconducting Filaments: Depth Profiling
Page 24 CEEE Technical Progress Bulletin - March 86

Superconduc tors , cont'd.

the Energy Gap of NbTi Filaments in

High-Field Magnet Wires, to be published in the Proceedings of the International Cryogenic Materials Conference

in Advances in Cryogenic Engineering - Materials, Vol. 32, Boston, Massachusetts, August 1 2-16, 1985.

Squeezable electron tunneling (SET)

junctions consisting of superconducting

NbTi filaments (extracted from magnet

wires) and sputtered Nb thin-film counter electrodes were used to determine

the energy gap at the surface of the

filaments. The current versus voltage

curves of junctions immersed in liquid

helium at 4 K were measured for a series

of filaments taken from the same wire.

Each filament had been etched to remove

a surface layer of varying thickness so that the energy gap could be determined

as a function of depth into the surface

of an average filament. It was found

that some manufacturing processes yield

filaments having surface layers with

reduced energy gaps of 0.4 meV compared

to measured interior bulk values ranging

from 1.2 to 1.3 meV.

[Contact: (303) 497-3641]

Recently Published

Ekin, J.W., Yamashita, T., and Hamasaki,

K. , Effect of Uniaxial Strain on the

Critical Current and Critical Field of

Chevrel Phase PbMOgS g Superconductors,

IEEE Transactions on Magnetics, Vol.

MAG-21, No. 2, pp. 474-477 (March

1985). [Proceedings of Applied Superconductivity Conference, San Diego,

California, September 9-1 3, 1984]

The first measurements of the effect of

uniaxial strain on the critical current

of a Chevrel-phase superconductor,

PbMOgSg, have been obtained at 4.2 K in

magnetic fields from 2 T to 24 T. Ihe

data show there is a very significant

reversible effect of elastic strain on the critical current of PbMo

g Sg

, comparable in magnitude to that observed in

This is because both the peak

pinning force and upper critical field

are very sensitive to elastic strain. A

correlation is noted between the elastic

strain effect, radiation sensitivity,

and crystal phase.

[Contact: (303) 497-5448]

Hong, M., Maher, D.M., Ellington, M.B.,

Heilman, F., Geballe, T.H. , Ekin, J.W.,

and Holthuis, J.T., Further Investigations of the Solid-Liquid Reaction

and High-Field Critical Current Density

in Liquid-Infiltrated Nb-Sn Superconductors, IEEE Transactions on Magnetics, Vol. MAG-21, No. 2, pp. 771-774

(March 1985). [Proceedings of Applied

Superconductivity Conference, San

Diego, California, September 9-13,

1984]

Superior superconducting properties,

such as high critical current density

(J c ) and transition temperature

(Tc ), have been obtained from reacted

liquid-infiltrated Nb-Sn composite

wires. These excellent properties are attributed to the chemistry and

structure of the material which is

prepared by a unique solid (Nb)-liquid

(Sn) reaction. From heat capacity

measurements, sharp bulk superconducting

transitions of the A1 5 phase occur at

17.2-18 K and the weight fraction of A1 5 in the composite wire is ~23%. Analytical electron microscopy techniques

have shown that: the microstructure of

these conductors consists of alternating

large- grain and small-grain filaments;

these two types of filaments correspond

to BCC Nb(Sn) and cubic A15

Nb 75±x Sn 25+x phases, respectively; the A1 5 filaments (<0.5 ym) are chemically homogeneous in terms of mea- sured x-ray intensity ratios to within

±7% which implies that x ~ 1.5; and the

A1 5 grains are essentially free of ex- tended lattice disorder down to a reso- lution of ~0.34 nm.

Recent work in which Nb is alloyed with

Ta has shown that these superconducting

properties can be improved upon; e.g. , high overall Jc

's of ~1 . 8 * 1

0

U A/cm

at 20 T and 4.2 K have been measured. Nb 3 Sn
CEEE Technical Progress Bulletin - March 86 Page 25

Superconductors , cont'd.

Also, the liquid-infiltrated Nb(Ta)-Sn

composites have a damage strain tolerance nearly double that of commercial

bronze-processed Nb-Sn conductors.

[Contact: John W. Ekin (303) 497-5448]

Magnetic Materials and Measurements

Released for Publication

Capobianco, T.E. , Fickett, F.R., and

Moulder, J.C., Mapping Eddy Current

Probe Fields, to be published in the

Proceedings of the Review of Progress

in quantitative Nondestructive Evaluation, Vol. 5.

The magnetic fields produced by four

different eddy current probes were

mapped in the near field with very small

(0.43-mm-diameter) inductive magnetic

field sensors. The four eddy current

probes included two nominally identical,

absolute, air core probes; an absolute

ferrite core probe; and a reflection

probe with an air core excitation coil

and two counterwound ferrite core pickup

coils. Measured fields for the air core

probes are compared with values calculated from the theory of Dodd and Deeds.

All measurements were performed at 10

kHz; for the ferrite core probe, the

field intensity was also measured from 1 kHz to 1 00 kHz using conventional methods . [Contact: (303) 497-3641]

Recently Published

Cromar, M.W., Clark, A.F., and Fickett,

F.R., The MBS Magnetic Monopole Detector, IEEE Transactions on Magnetics, Vol. MAG-21, No. 2, pp. 418-420

(March 1985). [Proceedings of Applied

Superconductivity Conference, San

Diego, California, September 9-13,

1 984]

We have built and operated several inductive type monopole detectors, the

present one having three concentric,

orthogonal loops operated in coincidence. The area of each loop is 200 cm2

, and the cross-sectional area of the

superconducting shield is 700 cm2 . The

detector loops are in a trapped magnetic

field of approximately 3 milligauss.

The system is mechanically stable and is

relatively insensitive to external disturbances, both mechanical and electromagnetic. The detector is quiet, having

a signal- to-noise ratio for monopole

detection of approximately 20. We have

also investigated several sources of

noise and spurious signals which might

mimic a monopole event.

[Contact: (303) 497-5375]

Other Electrical Systems Topics

Released for Publication

Duffield, C.L., Moreland, J. , and Fickett, F.R., Cryogenic Operation of

Bimorphs

Piezoelectric bimorphs constructed from

lead ti tanate-zirconate (PZT) ceramic

bonded to a brass sheet have been tested

at cryogenic temperatures to determine

their suitability for use in a lowtemperature micropositioner. Experimental data are presented on bimorph sensitivity (displacement per volt) as a function of the number of temperature

cycles. Results indicate that bimorphs

of this type cannot be calibrated because of irreversible changes in the

bending characteristics that occur while

cycling from room temperature to 4 K.

[Contact: John Moreland (303)

497-3641]

ELECTROMAGNETIC INTERFERENCE

Released for Publication

Adams, J.W., and Vanzura, E.J.,

Shielding Effectiveness Measurements of

Plastics

Measurement of shielding effectiveness

of plastic materials may give serious

problems due to the insulating nature of

many plastics. A method of making these

measurements using a flanged coaxial
Page 26 CEEE Technical Progress Bulletin - March 86

Electromagnetic Interference , cont'd.

holder overcomes these limitations.

[Contact: (303) 497-3328]

Crawford, M.L. , and Koepke, G.H. , Comparing EM Susceptibility Measurement

Results Between Reverberation and Anechoic Chambers, to be published in

the Proceedings of the 1985 IEEE International Symposium on Electromagnetic

Compatibility, Wakefield, Massachusetts, August 20-22, 1985.

This paper contains measurement results

obtained using a 2.74m x 3.1m x 4.6m

reverberation chamber and a 4.9m x 6.7m

x 8.5m anechoic chamber to determine the

susceptibility of equipment under test

(EUT) to incident electromagnetic radiation. Ihe frequency range was 200 MHz

to 18 GHz. The "correlation factor"

between the two techniques appears to be

directly proportional to the gain of the

EUT. Four sample EUTs included in this

study were a 1-cm dipole probe, a ridged

horn antenna, a small rectangular trans- verse electromagnetic (TEM) transmission

cell with an aperture, and a modified

2.75-in. diameter folded-fin aircraft

rocket.

[Contact: (303) 497-5497]

Cruz, J.E., Driver, L.D. , and Kanda, M.,

Design of the National Bureau of

Standards Isotropic Magnetic Field

Meter (MFM-10) 300 kHz to 100 MHz, to

be published as NBS Technical Note

1 085.

A broadband magnetic field meter has

been developed at the National Bureau of

Standards (NBS) for the frequency range

of 300 kHz to 100 MHz. The isotropic

antenna unit consists of three mutually

orthogonal loops, each 10 cm in diameter. The magnetic field probe described

in this paper has a measurement range of

0.1 to 30 A/m. The readout of the meter

is in terms of the Hermitian or "total"

magnitude of the magnetic field strength

which is equal to the root-sum-square

value of the three perpendicular magnetic field components at the measurement point. This magnetic field meter

has nearly perfect isotropy over its

dynamic range.

The electronic circuitry of the meter

obtains the total magnitude of all field

polarizations and all signals in the

entire frequency band. The sensor is

isotropic and is well suited for measuring the near field of an emitter, including regions of multiple reflections

and standing waves. The meter can be

used to monitor either the weak plane

wave fields in the far zone of a transmitter or the complicated fields very

close to a radiofrequency leakage

source. The features described in this

paper are: electronic design, physical

construction, alignment and adjustment

of the meter, and design

considerations.

[Contact: (303) 497-3763]

Gibson, K.A., and Miller, C.K.S., A

Bibliography of the NBS Electromagnetic

Fields Division Publications , to be

published as NBSIR 85-3022.

This bibliography lists the publications

of the personnel of the NBS Electromagnetic Fields Division in the period from

January 1982 through December 1983.

[Contact: (303) 497-31 32]

Kanda, M., Larsen, E.B., Bosero, M.,

Galliano, P.G. , Yokoshima, I., and

Nahman, N.S., Standards for Electromagnetic Field Measurements, to be

published in the forthcoming Special

Issue of the Proceedings of the IEEE on Radio Measurement Methods and Standards .

This paper describes the methodology tor

standard electromagnetic field measure- ments using anechoic chambers, opensites, guided wave structures, and

probes as transfer standards.

[Contact: (303) 497-5320]

Phelan, R.J., Jr., Larson, D.R., and

Simpson, P.A., A Sensitive, High

Frequency, Electromagnetic Field Probe

Using a Semiconductor Laser in a Small
CEEE Technical Progress Bulletin - March 86 Page 27

Electromagnetic Interference , cont'd.

Loop Antenna, to be published in

Proc. SP IE - The International Society

for Optical Engineering, 559 [Conference, San Diego, CA, August 18-23,

1 985] .

Using a loop antenna in series with a semiconductor laser, an optically

coupled electromagnetic field probe has

demonstrated sensitivities better than

1 yV/m/Hz 1/2 . The probe outside dimensions are equal to 5.7 x 5.7 x 1.3 cm3

. It can be used to measure frequencies as high as 2 GHz. The dynamic range is

estimated to exceed 6 orders of magnitude for incident microwave powers.

[Contact: (303) 497-3696]

Randa, J. , A Lattice-Action Approach

to Complex Electromagnetic Environments.

We present an approach to measurements

of complex electromagnetic environments

based on the numerical minimization of

the electromagnetic action functional on

a lattice in Euclidean space time. The

technique allows one to determine the

minimum power density consistent with a few measurements of the electric or magnetic field within a given volume.

Knowledge of the external sources irradiating the volume is not required.

[Contact: (303) 497-3150]

Wilson, P. F., and Ma, M.T. , Factors

Influencing Material Shielding Effectiveness Measurements, to be published in the Proceedings of the IEEE

1985 International Symposium on Electromagnetic Compatibility, Wakefield,

Massachusetts, August 20-22, 1985.

A material' s shielding effectiveness is

often measured in terms of insertion

loss, that is, the field reduction between a transmitter and receiver

achieved by introducing the shield material. The insertion loss concept is

simply stated; however, ambiguities

arise when one attempts to interpret

specific insertion loss measurements.

Insertion loss data depend not only on the shield material tested, but also on

the measurement procedure. The antenna

types used and their positioning, the

incident waveform and its wave impedance, and the contact resistance between

the test material and its mount (if any)

can all affect insertion loss measurements, sometimes dramatically. These

concepts are discussed based on the

simple model of coupling through an electrically small aperture, loaded and

unloaded, with the shield material.

Emphasis is on the importance of understanding and recognizing these factors

when making or interpreting the results

of shielding effectiveness

measurements.

[Contact: (303) 497-3842]

Wilson, P. F., and Ma, M.T. , Simple,

Approximate Expressions for HigherOrder Modes and Resonances in TEW

Cells

Simple, approximate expressions for

determining the cutoff frequencies of

the first few higher-order modes and the

associated resonances in TEM cells are presented. Both symmetric and asymmetric cells are discussed with examples.

[Contact: (303) 497-3842]

Recently Published

Bensema, W.D. , Reeve, G. , and Koepke,

G.F., A Multisensor Automated EM

Field Measurement System, Proceedings

of the IEEE Instrumentation and Measurement Technology Conference, Tampa,

Florida, March 20-22, 1985, pp. 200-

202 .

A system is being developed to monitor

and collect electromagnetic (EM) field

strength at multiple locations simultaneously. The system has two modes of

operation: (1) for sampling EM fields

that are stationary for times of the

order of 200 ms, and (2) for sampling

changing EM fields with a system resolution of 10 ys. Sensing elements for

Mode 1 consist of three electrically
Page 28

Electromagnetic Interference , cont'd.

short orthogonal dipoles mounted together, single dipole elements, or small

loop antennas. Each element feeds a separate data input channel for a maximum of 30 channels. Rf energy is con- verted to dc by a small diode detector

at each dipole. Several sets of 30

sensing elements each are planned to

cover specific measurement regions of

amplitude (1 V/m or greater) and frequency (100 MHz-18 GHz). Mode 2 sensors are diode detectors driven by broadband

antennas. System computer data processing proceeds in real time and includes

calculation of field strength based on probe calibrations and processing of

resultant data to satisfy measurement

goals

[Contact: (303) 497-3465]

Cruz, J.E., and Larsen, E.B., Screenroom Measurements of Antenna Factors,

Proceedings of the IEEE Instrumentation

and Measurement Technology Conference,

Tampa, Florida, March 20-22, 1985, p.

208.

The measurement of electromagnetic

fields in a shielded enclosure (screenroom) has serious problems because of

uncertain antenna factors and multipath

reflections from conductive surfaces.

Most electromagnetic interference anten- nas at NBS are calibrated in a known

field at an open-field site using the

standard antenna method. Because these

antenna factors are not necessarily

applicable for making measurements in a

s creenroom, the measurement errors are difficult to determine. This paper

presents the results for antenna factors

determined in a screenroom using the

two-antenna method. These antenna factors are compared with antenna factors

determined at an open-field site and in

an anechoic chamber. Experiment data are presented to show the variability of

antenna factor as a function of frequency and location in the screenroom,

thereby providing an indication of error bounds

[Contact: (303) 497-3763]

CEEE Technical Progress Bulletin - March 86

Hill, D.A., and Koepke, G.H., A NearField Array of Yagi-Oda Antennas for

Electromagnetic Sgsceptii^lity Testing, NBS Technical Note 1082 (July

1985) .

In electromagnetic susceptibility testing of electronic equipment, the ideal

incident field is a plane wave. To

approximate this condition, a seven- element array of Yagi-Uc[a antennas has

been constructed and tested at a frequency of 500 MHz. The element weightings are determined by a near-field

synthesis technique which optimizes the

uniformity of the field throughout a rectangular test volume in the near field of the array. The amplitude and

phase of the electric field has been

measured throughout the test volume with

a short dipole probe, and the agreement

with the theory is excellent.

[Contact: (303) 497-3472]

Kanda, M., and Nahman, N.S., Standards

for Measurement of Electromagnetic

Fields, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Tampa, Florida, March

20-22, 1985, pp. 20-23.

The standards developed at NBS for mea- surements of electromagnetic fields are reviewed along with the industrial

applications that engendered their development. Some attention is given to

future measurement requirements and the

NBS programs to meet them.

[Contact: (303) 497-5320]

Kanda, M., Randa, J. , and Nahman, N.S.,

Possible Estimation Methodologies for

Electromagnetic Field Distributions in

Complex Environments, NBS Technical

Note 1081 (March 1985).

The problem of measuring and characterizing complicated multiple-source,

multiple-frequency electromagnetic environments is becoming more important and more difficult as electrical devices

proliferate. This paper outlines thr<**» general approaches to the problem whi«'h are currently under investigation at the
CEEE Technical Progress Bulletin - March 86 Page 29

Electromagnetic Interference , cont'd.

National Bureau of Standards. The three

approaches are: (1 ) a statistical

treatment of the spatial distribution of

electromagnetic field intensities, (2) a numerical computation using a finitedifference (or lattice) form of the

electromagnetic action functional, and

(3) use of a directional probe to scan a volume. All three methods are still in

the development stage, but each appears

promising.

[Contact: (303) 497-5320]

Larsen, E.B., and Cruz, J.E., E and H

Fields in Transmission Lines and Coils

for Susceptibility Testing, Probe Calibration, and RF Exposure Chambers,

Proceedings of the IEEE Instrumentation

and Measurement Technology Conference,

Tampa, Florida, March 20-22, 1985, p.

1 99.

This paper deals with the instrumentation and design equations for several

systems used to generate calculable

electric (E) and magnetic (H) fields for

electromagnetic compatibility (EMC)

testing. These "standard" electromagnetic (EM) fields with known magnitude

are used to: (a) test the susceptibility of electronic equipment to radiated

fields, (b) calibrate E and H field

probes for measuring and mapping fields,

and (c) expose biological specimens in a known EM environment. The design and

use of so-called transverse electromagnetic (TEM) cells terminated in their

characteristic impedance are described

elsewhere.

[Contact: (303) 497-3540]

Ma, M.T., Kanda, M. , Crawford, M.L., and

Larsen, E.B., A Review of Electromagnetic Compatibility/lnterference Measurement Methodologies, Proceedings

of the IEEE, Vol. 73, No. 3, pp. 388-

41 1 (March 1985) .

This paper presents a review summary of

radiated emission and susceptibility

measurement methodologies currently used

for assessing the electromagnetic compatibility/interference (EMC/EMI) characteristics of electronic devices and

systems. In particular, measurement

methods using open sites, transverse

electromagnetic (TEM) cells, reverberating chambers, and anechoic chambers are

discussed, in the light of their technical justifications and bases, their

strengths and limitations, and interpretation of the measurement results.

[Contact: (303) 497-3800]

Wilson, P.F., and Ma, M.T., ShieldingEffectiveness Measurements with a Dual

TEM Cell, IEEE Transactions on Electromagnetic Compatibility, Vol. EMC-27,

No. 3, pp. 1 37-1 42 (August 1985).

Small- aperture theory is used to investigate the dual transverse electromagnetic (TEM) cell. Analyzing coupling

through an empty aperture versus a loaded aperture leads to a simple model

of dual-TEM-cell material shieldingeffectiveness (SE) measurements. Experimental data are compared to theory with

good agreement in the case of an empty

aperture. Some of the difficulties in

analyzing a loaded aperture are discussed.

[Contact: (303) 497-3842]

1986 CEEE Calendar

22-23 April (Gaithersburg, MD

)

Workshop on Test Procedures for Precision Instrumentation and ATE Systems

This Workshop is intended to provide a forum for the exchange of information

among researchers, users, manufacturers,

testing companies, and calibration laboratories on the procedures used in

testing the performance of precision

instrumentation and automatic test

equipment systems. Technical topics

planned include first-article and acceptance testing, bid-sample testing, maintenance and calibration testing, developing and writing specifications and

procedures, "minimum-use" specifications, test accuracy ratios, economic

tradeoffs of testing, case histories of
Page 30 CEEE Technical Progress Bulletin - March 86

1 986 CEEE Calendar , cont'd.

specific test programs, optimum calibration strategies, and recommended practices. The Workshop proceedings will be

published by the Institute of Electrical

and Electronics Engineers.

[Contact: John R. Sorrells, (301) 921-

2727]

23-27 June (Gaithersburg, MD

)

1986 CPEM (Conference on Precision Electromagnetic Measurements). CPEM 86 is

being sponsored by the U.S. National

Bureau of Standards, the IEEE Instrumentation and Measurement Society, and the

Union Radio Scientifique Internationale.

The Conference will present papers cov- ering the theory, design, performance,

simulation, and application of electromagnetic standards, measurements, techniques, instruments, and systems. Sessions are tentatively planned to cover

the following technical areas: electromagnetic-related fundamental constants

and standards; direct current, lew frequency, and radiofrequency; time, time

interval, and frequency; antennas and

fields; micrcwaves and millimeter waves;

infrared, visible, and ultraviolet radiation; lasers; electro-optics and fiber

optics; cryoelectronics; automated mea- surements; and technical calibration

services. The Conference language will

be English. [Contact: Sara Torrence,

(301) 921-2721. (For technical information, contact John R. Sorrells, (301)

921-2727 or Norman B. Belecki, (301)

921-2715. ) ]

9-10 September (Boulder, CO)

Symposium on Optical Fiber Measurements.

This fourth biennial Symposium is

devoted to measurements on optical

fiber, related components, and systems.

It is sponsored by NBS in cooperation

with the IEEE Optical Communications

Committee and the Optical Society of

America and is intended to provide a forum for reporting the results of

recent measurements research and for

evaluating these results in terms of

future directions. About one-quarter of

the sessions will be workshops led by

invited panelists. Summaries of

presented papers will be published in a technical digest to be distributed at

the Symposium.

[Contact: Susie A. Rivera, (303)

497-5342]

RECENTLY ISSUED

STANDARD REFERENCE MATERIALS

The first practical superconducting

standard reference material (SRM) has

been released by the Electromagnetic

Technology Division to the NBS Office of

Standard Reference Materials for sale to

the public. The certified parameter of

SRM 1457, Superconducting Critical Current — NbTi Wire, is critical current

at magnetic fields of 2,4,6, and 8 tesla

at a temperature of 4.2 K and an electric field criterion of 0.2 yV/cm.

Information is given to permit the user

to determine critical current for temperatures in the range 3.90 to 4.24 K

and electric field criteria from 0.05 to

0.2 yV/cm.

SRM 1457 consists of a 2.2-m length of a mul ti f i lime n tary , niobium-titanium,

copper-stabilized wire, wound in a single layer on a spool having a core diameter of 8.7 cm. The wire is evaluated

for 34 parameters relating to current,

voltage, magnetic field, temperature,

strain, and physical specimen characteristics.

In conjunction with ASTM Standard Test

Method B714-82, D-C Critical Current of

Composite Superconductors, the new SRM

is intended to provide means for calibrating apparatus used to measure key

parameters of superconductor products

and thus should be useful to buyers and

sellers of superconductors, users of

superconducting equipment, and re- searchers in superconducting technology.
CEEE Technical Progress Bulletin - March 86 Page 31

CEEE SPONSORS

National Bureau of Standards

Department of Commerce NOAA

Department of Defense

Defense Advanced Research Project

Agency; Combined Army/Navy/Air Force

Calibration Coordination Group;

Defense Nuclear Agency; National

Security Agency

U.S. Air Force

Boiling Air Force Base; Hanscom

Field; Newark Air Force Station;

Rome Air Development Center; Space

Division; Wright-Patterson Air Force

Base

U.S. Army

Aberdeen Proving Ground; Aviation

Research and Development Command;

Fort Monmouth; Harry Diamond

Laboratories; Fort Belvoir;

Redstone Arsenal; Materials and

Mechanics Research Center

U.S. Navy

Aviation Logistics Center (Patuxent

River); Naval Air Systems Command;

Naval Surface Weapons Center; Naval

Weapons Support Center (Crane);

Office of Naval Research; Naval

Research Laboratory

Department of Energy

Energy Systems Research; Fusion

Energy; Bonneville Power

Administration

Department of Justice

Law Enforcement Assistance

Administration

Charles Stark Draper Laboratory

Electronics Industries Association

Pood and Drug Administration

Hughes Aircraft Company

International Copper Research

Association

International Telecommunications

Satellite Organization

Massachusetts Institute of Technology

Sandia National Laboratories

University of California Los Alamos

Scientific Laboratory
NBS-114A (REV. 2 -80 ) U.S. DEPT. OF COMM. 1. PUBLICATION OR 2. Performing Organ. Report No. 3. Publication Date BIBLIOGRAPHIC DATA

REPORT NO.

March 1986 SHEET (See instructions) NBSIR-86/3344

4. TITLE AND SUBTITLE

Center for Electronics and Electrical Engineering Technical Progress Bulletin

Covering Center Programs, July to September 1985 with 1986 CEEE Events Calendar

5. AUTHOR(S)

E. Jane Walters, compiler

6. PERFORMING ORGANIZATION (If joint or other than NBS. see instructions

)

7. Con tract/ Grant No. NATIONAL BUREAU OF STANDARDS

DEPARTMENT OF COMMERCE «. Type of Report & Period Covered

WASHINGTON, D.C. 20234

9. SPONSORING ORGANIZATION NAME AND COMPLETE ADDRESS (Street, City, State. ZIP)

U.S. Department of Commerce

National Bureau of Stand ards

National Engineering Laboratory

Center for Electronics and Electrical Engineering

10. SUPPLEMENTARY NOTES

All technical information included in this document has been previously approved

for publication.

Q2] Document describes a computer program; SF-185, FIPS Software Summary, is attached.

11. ABSTRACT (A 200-word or less factual summary of most significant in formation. If document includes a significant

bi bl iography or literature survey, mention it here)

This is the twelfth issue of a quarterly publication providing information on the

technical work of the National Bureau of Standards Center for Electronics and

Electrical Engineering. This issue of the CEEE Technical Progress Bulletin covers

the third quarter of calendar year 1985. Abstracts are provided by technical area

for both published papers and papers approved by NBS for publication.

12. KEY WORDS (Six to twelve entries; alphabetical order; capitalize only proper names; and separate key words by semicolons)

antennas; electrical engineering; electrical power; electromagnetic interf er> nc ,• electronics; instrumentation; laser; magnetics; microwave; optical fibers; semi in- ductors ; superconductors

13. availability

GO Unlimited For Official Distribution, Do Not Release to NTIS

Order From Superintendent of Documents, U.S. Government Printing Office, Washington, D.C. 20402.

14. NO. OF

PRINTED PAGES

39

15. Price

|17~| Order From National Technical Information Service (NTIS), Springfield, VA. 22161 $9.95

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National Buroau of Standards

Gaithersburg, Md. 20899

OFFICIAL BUSINESS

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KEY CONTACTS:

Center Headquarters (720) Director, Mr. Judson C. French (301) 021-3357

Deputy Director Mr. Robert I. Scece (301) 021-3357

Electrosyetema Division (722) Chief, Dr. Oekare Petersons (301) 021-2328

Electromagnetic Fields Division (723) Chief, Mr. Charles K.S. Miller (303) 407-3131

Electromagnetic Technology Division (724) Chief, Dr. Robert A. Kemper (303) 407-3635

Semiconductor Electronics Division (727) Chief, Dr. Kenneth F. Qellowey (301) 021-3541

INFORMATION:

For additional Information on the Center for Electronics and Electrical Engineering, write or call:

Center for Eleotronlos and Electrical Engineering

National Bureau of Standards

Metrology Building, Room B-368

Gaithersburg, MD 20890

Telephone (301) 021-3357