# Patent

## Title
Semi-compensated pins for cold junction compensation

## Abstract

An apparatus and system is presented for partially compensating the cold junction of a thermocouple system using low cost semi-compensated conductors of system components accommodating various thermocouple types. The thermocouple system, comprises a thermocouple portion comprising two thermocouple types, each type composed of two different thermoelectric materials joined to form a hot junction, a semi-compensation portion comprising two substantially similar conductor pairs, each composed of a different material, wherein one conductor of each pair is composed of a material different than the thermoelectric materials of the respective thermocouple type of the thermocouple portion. The thermocouple system further comprises a cold junction compensation portion comprising at least two cold junction conductors composed of the same material, and wherein at least one conductor is composed of a different material than the conductor pairs of the semi-compensation portion, and a cold junction formed by the connection of the semi-compensation portion conductor pairs and the cold junction conductors. The conductors of the semi-compensation portion also engage with the thermoelectric materials of the thermocouple portion to provide an electrical interconnection therebetween, and to provide a partial compensation to the EMF developed at the cold junction of the respective thermocouple.

## Background
FIELD OF INVENTION
The present invention relates generally to thermocouples and more particularly to apparatus and systems for partially compensating the cold junction of a thermocouple system using low cost semi-compensated conductors.
BACKGROUND OF THE INVENTION
Thermocouples are analog temperature sensors that utilize the thermoelectric properties of two dissimilar materials, typically metals, to generate an EMF in proportion to a temperature gradient across a material inhomogeneity. Common thermocouples used in temperature measurement comprise two metal wires of different thermoelectric properties called thermoelements connected at one end to form a “hot junction” also known as a “measuring junction”. The other ends of the wires are connected to instrumentation such as a voltmeter to measure the EMF produced by the thermocouple. The wires are connected to the instrumentation at a known reference temperature to form a “reference junction” or a “cold junction”. For the most precise measurements it is desirable that the only material inhomogeneity in the measurement circuit occurs at the measurement junction where the two dissimilar materials are joined.
Because it is undesirable to have any other EMF sources between the measurement junction and the reference junction, it is important that there is a minimal temperature gradient across the thermoelectric material and the electrical instrumentation leads. Thermocouple materials are specialized alloys while electrical instruments typically utilize common metals such as copper, nickel, gold, beryllium copper, aluminum, and a variety of plating materials. This material inhomogeneity at the reference termination can lead to significant errors unless care is taken to minimize temperature gradients in this region or to accurately characterize the gradients that exist.
In addition, thermocouple assemblies must use expensive hardware in the connection schemes at the termination end. Rather than using common contact materials such as copper, nickel, gold, and others that are readily available, thermocouple connectors are made from more expensive thermocouple materials to minimize any inhomogeneity in the connector. A connector using thermocouple materials for the pins and sockets is referred to as a compensated connector. A compensated connector is designated to work only with a specific thermocouple type thus limiting the utility of the electronic instrumentation to only one type of sensor.
In thermocouple temperature measurement it is important to accurately establish the temperature of the reference junction in order to determine the temperature of the measured junction. In industrial temperature measurement, a temperature sensor such as an RTD, thermistor, diode, transistor, or an IC chip type sensor measures the cold junction. In almost all instances there will exist a temperature gradient between the cold junction sensor location and the location of the thermocouple leadwire termination. This temperature gradient is usually traversed by non-thermocouple wires or circuit board traces that generate little or no EMF. The result of this is an error in the temperature measurement that is approximately equal to the size of the temperature gradient.
A solution to the problem of a temperature gradient existing between the cold junction compensation (CJC) sensor and the thermocouple termination would be to use compensated materials for the lead connection and terminals. For example, a copper/constantan thermocouple (Type T) could use circuit board and terminals made from copper for the positive leg and constantan for the negative leg. This solution, however, has several negative aspects. The first and most obvious negative impact is the system is now only suitable for type T thermocouples because other types of thermocouples would experience an error from the different EMFs generated by the material differences. A second problem is a more practical problem of material availability. While copper is commonly available for terminals and printed circuit board traces, the other material, constantan, is not. Electrical hardware made from constantan or other common thermocouple alloys would be costly and would not be readily available.
Accordingly, there is a need for compensating the cold junction of a thermocouple system using low cost materials for system components accommodating various thermocouple types.
SUMMARY OF THE INVENTION
The following presents a simplified summary in order to provide a basic understanding of one or more aspects of the invention. This summary is not an extensive overview of the invention, and is neither intended to identify key or critical elements of the invention, nor to delineate the scope thereof. Rather, the primary purpose of the summary is to present some concepts of the invention in a simplified form as a prelude to the more detailed description that is presented later.
The present invention is directed to a thermocouple system for partially compensating the cold junction of the system using low cost semi-compensated materially similar conductor pairs of system components, thereby enabling multiple thermocouple types to be universally applied to a single thermocouple monitoring system. The present invention further accommodates the application of a variety of conductor materials providing improved mechanical, electrical and thermal properties when used in connector terminals, pins, screws or other such system interconnection components while maintaining lower component costs and greater material availability.
Current trends in electronics packages for thermocouples are leading toward a next generation thermocouple monitoring system capable of universally accommodating various types of thermocouple materials. Beneficially, the present invention takes a big step toward meeting this need in the thermocouple industry by establishing a system comprising interconnection conductors providing cold junction compensation compatible with multiple thermocouple material types.
In conventional thermocouple systems, there are a number of interconnection junctions between the thermocouple and the monitoring instrumentation. For example, the thermocouple system may have junctions between the thermocouple leadwires and a pair of male connector pins, between the male connector pins and a pair of female connector pins, between the female connector pins and a printed circuit board, and potentially between the printed circuit board and the voltmeter.
Each of these junctions offers an opportunity for producing a material inhomogeneity and an EMF (e.g., a voltage) corresponding to the thermal differential across the materials. Ideally, the EMF produced corresponds to that of the particular thermocouple. This problem is commonly addressed by either providing materials that generally match those of the thermocouple, called “fully compensated” system, or simply use a common unmatched conductor material throughout all the junctions after the thermocouple, forming a substantially “uncompensated” system. Generally speaking, all of the aforementioned junctions except the measuring junction are in the relative vicinity of the cold junction. Therefore it is the cold junction which is typically either fully compensated by matched material use or substantially uncompensated. The present invention addresses the benefits of semi-compensated conductors for a partially compensated thermocouple system having multiple thermocouple types.
The thermocouple system of the present invention comprises a thermocouple portion having two or more thermocouple types, each type composed of two dissimilar thermoelectric materials, a semi-compensation portion comprising two materially similar conductor pairs, each pair composed of two different conductor materials with at least one of the conductor materials of each pair different than that of the respective thermocouple type of the thermocouple portion, and a cold junction portion comprising two conductors of the same material and different than that of one of the semi-compensation portion conductors. The system of the present invention provides two significant dissimilar material junctions or transitions. These two transition regions provide a level of cold junction compensation, which is less than the fully compensated thermocouple system and more than the non-compensated system, and thus is a partially compensated or semi-compensated system.
In one aspect of the semi-compensated thermocouple system, the cold junction temperature is monitored by a temperature sensor such as an RTD, thermistor, diode, transistor, or an IC chip type sensor for CJC temperature correction.
In another aspect of the invention the conductors of the system may comprise male and female connector pins that operably engage for electrical interconnection and provide a semi-compensated CJC.
In still another aspect of the invention an insulative connector housing may be added to position the connector pins for mechanical alignment.
In yet another aspect of the invention the conductors of the system may comprise a screw terminal strip having materially similar pairs of screws for mechanically and electrically connecting the conductors providing a semi-compensated CJC.
In another aspect of the invention the thermocouple system may further comprise a printed circuit board (PC board, or PCB) for support of the cold junction conductors that are comprised of substantially the same materials, and optionally, for further support of the CJC sensor, and for support of a connector such as a pin header, a screw terminal strip, or another type connector.
In still another aspect of the present invention the specific conductor materials of the semi-compensation portion conductor pairs may be selected to develop a voltage for compensation at the cold junction of the thermocouple that is associated with the voltage developed by the thermoelectric materials used in the thermocouple portion. In this way, a desired level of partial compensation may be provided to the cold junction based on a set of thermocouples that is expected to be used.
To the accomplishment of the foregoing and related ends, the following description and annexed drawings set forth in detail certain illustrative aspects and implementations of the invention. These are indicative of but a few of the various ways in which the principles of the invention may be employed. Other aspects, advantages and novel features of the invention will become apparent from the following detailed description of the invention when considered in conjunction with the drawings.



BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a prior art diagram illustrating a conventional thermocouple device as provided by a thermocouple manufacturer such as may be used in a temperature monitoring system;
FIG. 2 is an accompanying schematic symbol of the prior art thermocouple of FIG. 1, and the polarity of an EMF provided by the device;
FIG. 3 is a chart of some of the properties of several thermocouple thermoelements such as may be used in the thermocouple system of the present invention;
FIG. 4 is a diagram illustrating the temperature at various junctions of an exemplary fully compensated thermocouple system used for temperature monitoring, demonstrating the EMF detected using the thermoelements and conductors between each junction and the EMF produced by the CJC sensor;
FIG. 5 is a diagram illustrating the temperature at various junctions of an exemplary uncompensated thermocouple system used for temperature monitoring, demonstrating the EMF detected using the thermoelements and conductors between each junction and the EMF produced by the CJC sensor;
FIG. 6 is a diagram illustrating the temperature at various junctions of an exemplary semi-compensated thermocouple system for temperature monitoring in accordance with the present invention, demonstrating the EMF detected using the thermoelements and conductors between each junction and the EMF produced by the CJC sensor;
FIG. 7 is a diagram illustrating the temperature at various junctions of another exemplary semi-compensated thermocouple system for temperature monitoring in accordance with the present invention, demonstrating the EMF detected using the thermoelements and conductors between each junction and the EMF produced by the CJC sensor;
FIG. 8 is a chart of some of the properties and relative merits of several exemplary thermocouple system conductors such as may be used in a variety of connectors of the TC systems of the present invention for partially compensating the cold junction in accordance with several aspects of the present invention;
FIGS. 9–10 illustrate several exemplary TC systems in accordance with various aspects of the present invention wherein the semi-compensating conductors of FIG. 8 and other such conductor combinations may be used;
FIGS. 11–13 illustrate a TC system comprising multiple TC types, having a semi-compensation portion with materially similar conductor pairs, in accordance with the present invention; and
FIG. 14 is a diagram illustrating the temperature at various junctions of yet another exemplary semi-compensated thermocouple system for temperature monitoring using a screw terminal strip connector in accordance with the present invention, demonstrating the EMF detected using the thermoelements and conductors between each junction and the EMF produced by the CJC sensor.



DETAILED DESCRIPTION OF THE INVENTION
The present invention will now be described with reference to the attached drawings, wherein like reference numerals are used to refer to like elements throughout. The invention relates to a thermocouple measurement system for partially compensating the cold junction of the system using materially similar pairs of system components comprising low cost conductors, thereby enabling multiple thermocouple types to be universally applied to a single thermocouple monitoring system.
Conventionally, expensive thermoelements may be used to fully compensate the junctions of a TC system. Alternately, conventional systems may not use any cold junction compensation rather than absorb the high cost of thermoelement based connection hardware. The thermocouple system of the present invention, rather, strikes a midway approach to either of these extremes, and in the process further presents a solution that provides a thermocouple system that is equally suited to a variety of TC material types. In order to better appreciate one or more features of the invention, several exemplary implementations of the temperature monitoring system, the thermoelements, some of the semi-compensation conductors and the benefits of each are hereinafter illustrated and described with respect to the following figures.
FIG. 1 illustrates a conventional thermocouple device 100, such as may be provided by a thermocouple manufacturer and used in a temperature monitoring system, while FIG. 2 illustrates an accompanying schematic symbol 200 of the thermocouple of FIG. 1. Most common thermocouples are temperature measuring devices or sensors comprising two dissimilar metals connected together at one end, called the hot junction. The two metals have a polarity with respect to each other and one of these is referred to as the positive leg and the other as the negative leg. The two free ends, called the cold end, generate a voltage (EMF) proportional to the temperature difference between the hot end and the cold end.
Referring back to FIG. 1, the conventional thermocouple typically has a stainless steel sheath 110 for protection over the hot junction that may be potted therein (e.g., a ceramic, or epoxy potting material), together with a transition 120 (e.g., stainless steel) to protect the transition to a length of high temperature insulated leadwire 130. The leadwire 130 may also have a length of heatshrink protection and a label 140 before it terminates in a mini-plug connector 145.
FIG. 3 illustrates a chart 300 of some of the properties of several thermocouple thermoelements such as may be used in a variety of thermocouple systems including the TC system of the present invention. Many of the more commonly used thermoelement combinations have been assigned letter designations (e.g., J, K, and T) for easy reference to their more complex material and elemental compositions shown. Each thermoelement material combination has a more positive and a more negative polarity based on the thermal characteristics of each element which provides an EMF, identified as the Seebeck Coefficient, as a function of the thermal differential between the hot and cold junction of each TC type. Each TC combination also has a useful operating temperature range, also based on the thermal and mechanical characteristics of the elemental compositions.
For example, the K type thermocouple is comprised of a nickel-chrome (+) thermoelement (typically in the form of a wire) joined to a nickel-aluminum-silicon (−) thermoelement. Nickel-chrome is the more positively polarized type K thermoelement (KP) comprising Nickel and Chromium, while the more negatively polarized Nickel-aluminum-silicon thermoelement (KN) comprises Nickel, Aluminum and Silicon. This TC combination provides a Seebeck Coefficient of approximately 0.041 mV/° C. over a 0–1260° C. temperature range. This may best be appreciated in the following figures.
FIGS. 4–7 illustrate several diagrams of the temperature at various junctions of several types of thermocouple systems used for temperature monitoring. FIGS. 4–7 also illustrate the EMF detected using the thermoelements and conductors between each junction and the EMF produced by a CJC sensor that is typically located as close as possible to the cold junction for measuring the cold junction temperature.
FIG. 4, for example, illustrates a diagram of an exemplary fully compensated thermocouple system 400 used for temperature monitoring. As previously discussed, in current thermocouple systems, there are a number of interconnection junctions between the thermocouple and the monitoring instrumentation. In FIG. 4, for example, the thermocouple system 400 comprises a type K thermocouple measuring junction 405 and may have junctions 410a, 410b in the type K positive (KP) leadwire 415a and negative (KN) leadwire 415b, respectively, between the thermocouple leadwires 415 and a pair of male connector pins KP 420a and KN 420b 
The KP notation on both sides of junction 410a, and the KN on both sides of junction 410b indicate that no material inhomogeneity has taken place at these junctions between the TC leadwire and the male connector pins. The fully compensated TC system 400 has another junction 425a, 425b between the male connector pins KP 420a and KN 420b and a pair of female connector pins KP 430a, KN 430b, again with no material inhomogeneity. Finally, the fully compensated TC system 400 has a junction 435a, 435b between the female connector pins KP 430a, KN 430b and a printed circuit board. The printed circuit board PCB typically has copper printed circuit traces 440a, 440b that are eventually connected to a voltmeter 450. This final female connector to PCB junction 435 is the only junction in the system with a material inhomogeneity or a material transition 455.
Although there is a material transition 455 at this junction 435a, 435b, because a CJC sensor is utilized at this junction establishing a known reference temperature, the cold junction is said to be fully compensated to this point.
In FIGS. 4–7, exemplary temperature zones (T1–T4) are illustrated at four identified junctions of the systems and the EMFs produced by the dissimilar materials (thermoelements and conductors) between each junction and the EMF produced by the CJC sensor. The four identified junctions of the system also divide the system into four basic sections or portions, a TC portion 460, a TC male connector 465, a PC board female connector 470, and the PC board CJC Portion 475. The four temperature zones chosen are: a 100° C. measurement temperature 480 at the TC thermocouple junction (e.g., 405 of FIG. 4), a 30° C. temperature 485 at the TC to TC male connector junction (e.g., 410a, 410b of FIG. 4), a 25° C. temperature 490 at the TC male to PCB female connector junction (e.g., 425a, 425b of FIG. 4), and a 20° C. temperature 495 at the PCB female to PCB CJC portion junction (e.g., 435a, 435b of FIG. 4).
Given these temperature differentials and the TC materials used, the EMF produced in each section of the fully compensated system of FIG. 4 is as follows:













Area
Material
Temp differential
EMF







TC Portion
K
T1 = (100 − 30)° C. = 70° C.
=2.893 mV


TC Male Conn.
K
T2 = (30 − 25)° C. = 5° C.
=0.203 mV


PCB Female
K
T3 = (25 − 20)° C. = 5° C.
=0.202 mV


Conn.


PCB CJC Portion
CJC
T4 = (20 − 0)° C. = 20° C.
=0.798 mV




TOTAL =
=4.096 mV









Since a type K thermocouple produces 4.096 mV at 100° C., there is no error produced by the fully compensated TC system having a single material inhomogeneity 455 after that of the TC measurement junction 405, and then only at the cold junction.

By contrast, FIG. 5 illustrates an exemplary uncompensated thermocouple system 500 used for temperature monitoring. This TC system 500 is illustrated similarly to that of FIG. 4 except that the only thermoelements used in the system are the thermoelements KP 415a, KN 415b used in the type K thermocouple itself of the TC portion 460. For example, a single conductor such as copper 520 is used throughout the rest of the system 500 from junction 510a, 510b, to a connector junction 525a, 525b, to the CJC junction 535a, 535b. Therefore the uncompensated system 500 of FIG. 5, also has only one junction of material inhomogeneity 545 after that of the TC measurement junction 405. As previously discussed, the problem here is that no EMF is generated across the homogenous material junctions to compensate the actual temperature differentials across those conductors.
Given the same temperature differentials, and the TC materials used in accordance with the uncompensated system of FIG. 5, the EMF produced in each section is as follows:













Area
Material
Temp differential
EMF







TC Portion
K
T1 = (100 − 30)° C. = 70° C.
=2.893 mV


TC Male Conn.
Cu
T2 = (30 − 25)° C. = 5° C.
=0.000 mV


PCB Female
Cu
T3 = (25 − 20)° C. = 5° C.
=0.000 mV


Conn.


PCB CJC Portion
CJC
T4 = (20 − 0)° C. = 20° C.
=0.798 mV




TOTAL =
=3.691 mV









Since a type K thermocouple produces 3.691 mV due to thermal EMFs representing 90° C. while the actual temperature is 100° C., there is an error of 10° C. produced by the uncompensated TC system of FIG. 5, having a single material inhomogeneity 545 after the TC measurement junction 405, and does not reside at the cold junction. Although this system is much less expensive than that of the fully compensated system of FIG. 4, a significant error is also likely.

A better solution to these extremes is the use of common materials to create semi-compensated terminations, for example, in the conductors or terminal pins of the connectors discussed. Semi-compensated electrical hardware of the present invention generate a portion of the EMF expected from common thermocouple types over any temperature gradient existing between the CJC sensor and the electrical termination. For instance, electrical hardware using copper for the positive leg connections and nickel for the negative leg connection yields a combination Cu/Ni Seebeck coefficient of:




  
    
      
        
          Cu
          =
          
            0.0076
            ⁢
            
              
            
            ⁢
            
              mV
              /
              °
            
            ⁢
            
              
            
            ⁢
            
              C
              .
            
          
        
      
    
    
      
        
          Ni
          =
          
            
              -
              0.0148
            
            ⁢
            
              
            
            ⁢
            
              mV
              /
              °
            
            ⁢
            
              
            
            ⁢
            
              C
              .
            
          
        
      
    
  
  
    
      Cu
      -
      Ni
    
    =
    
      0.0224
      ⁢
      
        
      
      ⁢
      
        mV
        /
        °
      
      ⁢
      
        
      
      ⁢
      
        C
        .
      
    
  




This Cu—Ni combination produces about half the EMF output of a type K thermocouple that produces roughly 0.041 mV/° C. near room temperature. Thus the semi-compensated materials would correct about 1⁄2 of the EMF of a type K thermocouple. While this is not a perfect compensation it has the advantage of being made from common materials and being applicable to a variety of other thermocouple types. A type J thermocouple has around 0.06 mV/° C. and so the semi-compensated conductors (e.g., pins, terminals, etc.) would recover around a third of any error associated with a temperature gradient across a junction or connector inhomogeneity.
FIGS. 6 and 7, for example, illustrate exemplary semi-compensated thermocouple systems 600 and 700, respectively, for partially compensated temperature monitoring in accordance with the present invention. FIGS. 6 and 7 provide junctions between each of the same four areas or portions of the system as identified previously in FIGS. 4 and 5, namely: the TC portion 460, the TC male connector region 465, the PC board female connector region 470, and the PC board CJC portion 475. FIGS. 6 and 7 are also illustrated using the same four temperatures: 100° C. at 480, 30° C. at 485, 25° C. at 490, and 20° C. at 495, as used in FIGS. 4 and 5.
By contrast to either the fully compensated or the uncompensated TC system, semi-compensation is provided by the choice of the conductors used between the TC portion 460 and the PC board CJC portion 475, that is, in what is termed herein, the “semi-compensated portion”, or SC portion. The SC portion is further defined and bounded by at least two junctions having material inhomogeneities (e.g., 645 and 655 of FIG. 6, or 745 and 755 of FIG. 7).
For example, in FIG. 6, junction 610a, 610b transitions from KP/KN to Cu/Ni, respectively. Although 645 is a material inhomogeneity, an EMF is still produced traversing conductors 620A , 620b and 630a, 630b within the connectors 465 and 470 and conductors 640a, 640b within the PC Board CJC Portion 475 and junctions 625a, 625b and junctions 635a, 635b therebetween, because the materials of conductors 620a and 620b are dissimilar, and because the materials of conductors 630a and 630b are dissimilar (e.g., Cu vs. Ni, respectively). Thus, the material inhomogeneities 645 and 655 of the exemplary TC system of FIG. 6 define an SC portion for partially compensating the cold junction.
Using the same temperature differentials as before, and the TC materials and conductor materials of the semi-compensated system of FIG. 6, the EMF produced in each section is as follows:













Area
Material
Temp differential
EMF







TC Portion
K
T1 = (100 − 30)° C. = 70° C.
=2.893 mV


TC Male Conn.
Cu/Ni
T2 = (30 − 25)° C. = 5° C.
=0.112 mV


PCB Female
Cu/Ni
T3 = (25 − 20)° C. = 5° C.
=0.112 mV


Conn.


PCB CJC Portion
CJC
T4 = (20 − 0)° C. = 20° C.
=0.798 mV




TOTAL =
=3.915 mV









Since a type K thermocouple produces 3.915 mV due to thermal EMFs representing 95° C. while the actual temperature is 100° C., there is an error of 5° C. produced by the semi-compensated TC system of FIG. 6, having at least two material inhomogeneities 645 and 655 after the TC measurement junction 405. The semi-compensated system 600 is still much less expensive than that of the fully compensated system 400 of FIG. 4, but only produces half the error of the uncompensated system 500 of FIG. 5. In addition to providing the cost advantage, other mechanical, electrical, and thermal benefits of the Cu/Ni combination and other semi-compensating conductor combinations are obtained and will be discussed in more detail in association with FIG. 8.

In another semi-compensation example of the present invention illustrated in FIG. 7, junction 710a, 710b may retain the type K materials in the TC male connector 465 conductors KP 720a and KN 720b, then at junction 725a and Ni 730b, respectively, producing a material inhomogeneity 745. Again, although 745 is a material inhomogeneity, an EMF is still produced traversing conductors 720a, 720b and 730a, 730b within the connectors 465 and 470, and junctions 735a, 735b, and connectors 740a, 740b within PC Board CJC Portion 475 because the materials of conductors 720a and 720b are dissimilar, and because the materials of conductors 730a and 730b are dissimilar (e.g., Cu vs. Ni, respectively). Thus, the material inhomogeneities 745 and 755 of the exemplary TC system of FIG. 7 define an SC portion for partially compensating the cold junction.
Using the same temperature differentials as before, and the TC materials and conductor materials of the semi-compensated system of FIG. 7, the EMF produced in each section is as follows:













Area
Material
Temp differential
EMF







TC Portion
K
T1 = (100 − 30)° C. = 70° C.
=2.893 mV


TC Male Conn.
K
T2 = (30 − 25)° C. = 5° C.
=0.203 mV


PCB Female
Cu/Ni
T3 = (25 − 20)° C. = 5° C.
=0.112 mV


Conn.


PCB CJC Portion
CJC
T4 = (20 − 0)° C. = 20° C.
=0.798 mV




TOTAL =
=4.006 mV









Since a type K thermocouple produces 4.006 mV due to thermal EMFs representing 97.5° C. while the actual temperature is 100° C., there is an error of only 2.5° C. produced by the semi-compensated TC system of FIG. 7, having at least two material inhomogeneities 745 and 755 after the TC measurement junction 405. The semi-compensated system 700 is still less expensive than that of the fully compensated system 400 of FIG. 4, but only produces one quarter of the error of the uncompensated system 500 of FIG. 5.

Thus, several electrical and economic benefits of using common semi-compensating conductor materials for the junctions of a single TC type measurement system have been shown. However, further economic and user advantages are available in providing a TC monitoring system, in accordance with the present invention, wherein the same pair combination of conductor materials is used for a TC system having multiple TC types. In particular, it is advantageous for the user of the system to be able to plug any number of a list of thermocouples into the same thermocouple receptacles, as well as less expensive for the manufacturer to supply a connector, screws or pins, for example, with common and more readily available hardware materials.
To avoid the electrical loss of uncompensated hardware, and the high cost and poor material availability of fully compensated hardware, the present invention attempts to provide a system using materially similar pairs of common conductor materials for receiving multiple TC types. For example, as will be further shown in association with the following figures, two various types (e.g., type J, T, K, N, S) of thermocouples may be both interconnected into a TC system using two pairs of Cu vs Ni semi-compensating conductor hardware.
There are a variety of material combinations for semi-compensated conductors or pins including aluminum vs. nickel with a Seebeck coefficient of around 0.019 mV/° C., iron vs. nickel at 0.035 mV/° C., or palladium vs. platinum at 0.006 mV/° C. Thus, a variety of semi-compensation levels are available to accommodate various requirements of the system as shown in the following figure.
FIG. 8, for example, illustrates a chart 800 of several exemplary semi-compensation conductor combinations that may be used for partially compensating the cold junction of the TC systems in accordance with several aspects of the present invention. The list of semi-compensation conductors is ordered from lowest to highest Seebeck coefficient. Chart 800 further compares some of the properties and relative merits of the exemplary semi-compensation conductor combinations such as may be applicable to a variety of pins, terminals, and screw connectors and terminal strips, however, copper and nickel appear to be one of the more preferred embodiments.
In addition, the specific combination of semi-compensation conductors may be selected in accordance with an aspect of the present invention to best coordinate with the range of Seebeck coefficients of the thermocouples used, to provide a particular level of compensation desirable for the TC system application. If, for example, a TC System uses a type J and a type K thermocouple, another set of semi-compensated conductors could be selected for the TC system, which provided a Seebeck coefficient midway between that of the type J and K thermocouples, yet had good cost, mechanical, electrical and thermal properties similar to those of the Cu/Ni combination, a higher level of semi-compensation may be attained for the TC system at a low cost.
For example, an Iron/Nickel combination would be the best choice from FIG. 8 with the highest Seebeck coefficient output of 0.035 mV/° C. to coordinate with the type J and K thermocouple Seebeck coefficients of 0.06 mV/° C. and 0.041 mV/° C., respectively, but the Fe/Ni combination may have poor electrical and thermal properties compared to the use of Cu/Ni that may outweigh the EMF advantage of Fe/Ni in many applications. Although the Cu vs. Ni conductor combination has been shown and described in the examples and figures of the invention, a variety of other combinations of semi-compensation conductors including metals, alloys, and metal or alloy platings and depositions are also anticipated in the context of the present invention.
FIGS. 9–14 illustrate several exemplary TC systems in accordance with various aspects of the present invention and FIGS. 6 and 7, wherein the semi-compensating conductors of FIG. 8 and other such conductor combinations may be used to partially compensate a cold junction of the system. A variety of pins, terminals, and screws of connectors and terminal strips are used in the TC systems illustrated in the figures, wherein one or more semi-compensation conductor combinations may be utilized. FIGS. 11–13 illustrate a TC system comprising multiple TC types, having a semi-compensation portion with materially similar conductor pairs, in accordance with the present invention. Although FIGS. 9, 10 and 14 illustrate only one conductor pair of a multiple TC type system, it should be appreciated that other such TC types will also be coupleable to the conductor pair illustrated together with other conductor pairs, whereby semi-compensation of the system is accomplished.
FIG. 9 illustrates an exemplary semi-compensated TC system 900. TC system 900 uses a type K thermocouple sensor 905 having a male plug 910. The male plug 910 engages a female connector 915 affixed to a printed circuit board (PCB) 920. The positive KP (TC+) and negative KN (TC−) leadwires of the type K TC 905 are connected to a pair of male pins 925a and 925b, respectively, mounted in an insulative plug housing 930 of the male plug 910. A junction 935a, 935b having a material inhomogeneity is formed where the leadwires KP/KN join the male pins 925a, 925b (e.g., Cu/Ni pins), respectively. The male pins 925a, 925b engage female pins 940a, 940b (e.g., Cu/Ni pins), respectively, mounted in an insulative receptacle housing 945 of the female receptacle 915. Another junction is formed where the male pins 925a, 925b engage the female pins 940a, 940b, respectively. Typically, this junction will not, but may or may not have a material inhomogeneity.
Another junction termed a cold junction 950a, 950b having a material inhomogeneity is formed where the female pins 940a, 940b (e.g., Cu/Ni pins) attach to the traces 955a, 955b (e.g., typically copper traces), respectively, of the PCB 920. Near, and usually between the junctions 950a, 950b, where the female pins 940a, 940b join the PCB 920, a cold junction compensation CJC sensor 960 (e.g., an RTD, thermistor, diode, transistor, or an IC chip type sensor) is mounted to detect the temperature of the cold junction 950a, 950b for CJC temperature correction of the TC system. PCB traces 965 attach to the CJC sensor 960 for external detection of the ambient temperature at the cold junction 950a, 950b. Knowing the CJC temperature is usually critical to the accurate ambient temperature compensation of the system, so CJC sensor 960 may also be potted or otherwise thermally bonded near the cold junctions 950a, 950b. 
Thus, in the example of FIG. 9, two junctions (935a, 935b and 950a, 950b) having material inhomogeneities in accordance with the invention are present in the semi-compensated TC system 900. TC system 900 utilizes semi-compensated conductor material combinations (e.g., Pd/Pt, Cu/Ni, Al/Ni, Au/Ni, and Fe/Ni) in the form of male and female pins 925a, 925b and 940a, 940b, respectively. The male and female pins in this example form the semi-compensated portion (SC portion) of the system 900 referred to in the system 600 of FIG. 6. If in this example Cu/Ni were used for the semi-compensation materials for these conductors, the error produced by the system would correspond to that of system 600 of FIG. 6. Alternately, if the male pins 925a, 925b were comprised of KP/KN material, and only the female pins 940a, 940b were comprised of the Cu/Ni semi-compensation conductor materials, the error produced by the system would correspond to that of system 700 of FIG. 7.
Although a male plug/pins has been shown and described in the examples and figures of the invention in association with a thermocouple, and a female receptacle/pins has been used in association with a PCB, a female plug/pins used in association with the thermocouple, and a male receptacle/pins used in association with the PCB or wiring to another such circuit is also anticipated in the context of the present invention.
FIG. 10 illustrates another exemplary semi-compensated TC system 1000. TC system 1000 is similar to that of TC system 900 of FIG. 9 in many ways and therefore need not be described again in detail except where the systems differ. For example, system 1000 again is illustrated using a type K thermocouple sensor 1005 attached to a plug 1010 that engages a receptacle 1015 affixed to a printed circuit board (PCB) 1020. In this example, the plug 1010 and receptacle 1015 are configured as PCB mounted pin/socket header type connectors. The positive and negative leadwires KP/KN of the type K TC 1005 are connected to a pair of female pins 1025a and 1025b this time, respectively, mounted in an insulative plug housing 1030 of the plug 1010. A junction 1035a, 1035b having a material inhomogeneity is formed where the KP/KN leadwires join the female pins 1025a, 1025b (e.g., Al/Ni pins), respectively. The female pins 1025a, 1025b engage male pins 1040a, 1040b (e.g., Al/Ni pins), respectively, mounted in an insulative receptacle housing 1045 of the receptacle 1015. Another junction is formed where the male pins 1025a, 1025b engage the female pins 1040a, 1040b, respectively.
A cold junction 1050a, 1050b having the second material inhomogeneity is formed where the male pins 1040a, 1040b (e.g., Al/Ni pins) attach to the traces 1055 (e.g., typically copper traces) of the PCB 1020. A cold junction compensation CJC sensor 1060 (e.g., an RTD, thermistor, diode, transistor, or an IC chip type sensor) is mounted near the PCB junctions 1050a, 1050b of the male pins 1040a, 1040b to detect the temperature of the cold junction 1050a, 1050b for CJC temperature correction of the TC system 1000.
Thus, in the example of FIG. 10, two junctions (1035a, 1035b and 1050a, 1050b) having material inhomogeneities in accordance with the invention are formed in the semi-compensated TC system 1000. Again, the TC system 1000 utilizes semi-compensated conductor material combinations (e.g., Pd/Pt, Cu/Ni, Al/Ni, Au/Ni or Fe/Ni) in the form of female and male pins 1025a, 1025b and 1040a, 1040b, respectively, thus forming the SC portion of the system 1000 similar to that of system 600 of FIG. 6 or system 700 of FIG. 7.
The pin headers of FIG. 10 may provide an additional benefit, where multiple TCs are to be interconnected to a single PCB, as each pair of pins/sockets of the mating headers offering an additional opportunity to engage another TC in a compact layout. The small conductor lengths of the male and female pins also tend to minimize thermal differentials in the exemplary TC system.
FIG. 11 illustrates an exemplary TC system 1100 comprising multiple TC types, in accordance with the present invention. TC system 1100 comprises a TC portion 1110 having two or more TC types (e.g., 4 types) for example, TC1 is a type J thermocouple 1111, TC2 is a type T thermocouple 1112, TC3 is a type K thermocouple 1113, and TC4 is a type S thermocouple 1114. System 1100 further comprises a semi-compensation portion 1120 having materially similar conductor pairs 1121, for example, comprising semi-compensating conductor pairs (e.g., Au/Ni, Cu/NI, Pd/Pt) 1121 that are materially similar for all the TC types used in the system.
Each TC of the multiple TC type system 1100 is coupled to one of the materially similar conductor pairs 1121, wherein one of the conductors of each pair 1121 is composed of a material different than the thermoelectric materials of the TC portion 1110. System 1100 also comprises a cold junction compensation portion CJC 1130 using the same conductor material throughout all the conductor pairs, for example, conductor pairs 1131 all comprise one material type (e.g., Cu, Ag, Au). The CJC portion 1130 further comprises one or more thermal sensors (not shown) near the junction of the semi-compensation portion 1120 and the CJC portion conductor pairs 1131, wherein multiple semi-compensated temperature measurement outputs 1140 may be provided.
For example, FIG. 12 illustrates an exemplary TC system 1200 comprising multiple TC types, in accordance with the present invention and TC system 1100 of FIG. 11, which is similar to that of FIG. 12, and as such need not be described again in full detail except where noted. TC system 1200 also comprises a TC portion 1210 having, for example, four TC types 1210a, TC1 is a type J thermocouple 1211, TC2 is a type T thermocouple 1212, TC3 is a type K thermocouple 1213, and TC4 is a type S thermocouple 1214. Although four different TC types, are illustrated in FIG. 12, any number or combination of each TC type or other such TC types may be used as desired.
System 1200 further comprises a semi-compensation portion 1220 having materially similar conductor pairs, for example, a pair of Cu and Ni conductors 1221 comprise the semi-compensating conductor pairs (e.g., Au/Ni, Cu/NI, Pd/Pt) that are materially similar for all the TC types 1210a used in the system 1200. Each TC of the multiple TC type system 1200 is coupled at junction 1222 to one of the materially similar conductor pairs 1221, wherein one of the conductors of each pair 1221 is composed of a material different than the thermoelectric materials of the TC portion 1210. In the illustration, the SC portion 1220 also exemplifies a TC male connector 1220a and TC female connector 1220b having metallic conductors, or other such conductive hardware for engaging forming a junction 1225 therebetween.
System 1200 also comprises a cold junction compensation portion CJC 1230 using the same conductor material throughout all the conductor pairs, for example, conductor pairs 1231 all comprise one material type (e.g., Cu, Ag, Au). For example, in one embodiment the CJC portion 1230 may be a printed circuit board cold junction compensation portion 1230a. The CJC portion 1230 further comprises one or more thermal sensors (not shown) near the junction 1235 of the semi-compensation portion 1220 and the CJC portion conductor pairs 1231, wherein multiple semi-compensated temperature measurement outputs 1240 may be provided. For example, the multiple semi-compensated outputs 1240 may be coupled to a multiplexing analog to digital converter ADC 1250 for further measurement processing, output, or display. The connector configuration of FIG. 10, for example, illustrates one element of such a multiple TC type system. Connector bodies 1030 and 1045, for example, may be PCB mounted headers manufactured using any one of a variety of common semi-compensating conductor pairs (e.g., 1025a, 1025b, and 1040a, 1040b) for interconnecting the TC types to the cold junctions.
FIG. 13 illustrates another exemplary semi-compensated TC system 1300. TC system 1000 is somewhat different from the TC systems of FIGS. 9 and 10. A screw terminal strip mounted to a PC board replaces plugs and receptacles, while a screw and terminal conductors replace the male and female pin conductors. By eliminating the plug from the TC system, the screw terminal strip also benefits the system by eliminating one junction, namely, the leadwire to plug junction (e.g., 935 of FIG. 9, or 1035 of FIG. 10). This is because the screw head presses the TC+/TC− leadwires directly into the terminal conductor, without an additional plug junction. Similar to the header configuration of FIG. 10, the terminal strip of FIG. 13 offers an in-line configuration suitable for multiple TC connections, as shown.
In one example, the semi-compensated TC system 1300 of FIG. 13 comprises a type J thermocouple TC1 1305, and a type T thermocouple TC2 1310, whose thermoelement leadwires are wired to a screw terminal strip having screw and terminal conductor pairs comprising semi-compensating conductor material combinations (e.g., Pd/Pt, Cu/Ni, Al/Ni, Au/Ni, and Fe/Ni). For example, the TC+ lead wires may be retained by Au or Au plated screws 1315a and 1320a and terminal conductors 1325a and 1320a, while the TC− lead wires may be retained by Ni or Ni plated screws 1315b and 1320b and terminal conductors 1325b and 1320b to the terminal strip 1335, respectively. The terminal strip 1335 is attached with conventional screw hardware 1340 to the PCB 1345.
From this point, the terminal conductors 1325a, 1325b and 1330a, 1330b are joined to conductive traces 1350a, 1350b and 1355a, 1355b of the PCB 1345. Once the terminal conductor is joined to the PCB conductive traces, the remaining portion of the system may be described similar to that of FIGS. 9 and 10, therefore need not be described again in detail except where the systems differ. CJC temperature sensors 1360 and 1365 are located near the cold junction terminals 1370 of the TC1 type J 1305 and the TC2 type T 1310 thermocouples, respectively. PCB traces 1370a, 1370b and 1375a, 1375b attach to the CJC sensors 1360 and 1365, respectively, for external detection of the ambient temperature at the cold junctions 1370.
FIG. 14 illustrates a diagram 1400 of the exemplary semi-compensated thermocouple system 1300 of FIG. 13, using a screw terminal strip in accordance with the present invention. FIG. 14 is illustrated and may be described similar to that of the TC system 700 of FIG. 7, and as such need not be fully described again for the sake of brevity. System 1400 demonstrates that the EMF detected from type K thermocouple 405 at 100° C. 480 is conveyed over leadwires KP/KN 415a, 415b through a mid-point of the thermocouple (TC) portion 1460 having a temperature of 30° C. 1485 and directly to a junction 1425a, 1425b at 25° C. 490, having a first material inhomogeneity 1427, to a semi-compensating conducting material combination (e.g., Cu/Ni, or Au/Ni) comprising the screws and terminal conductors 1430a, 1430b. The screws and terminal conductors 1430a, 1430b terminate into a PC board forming another junction 1435a, 1435b having a second inhomogeneity 1437 transitioning to conductive copper traces 1440a, 1440b on the PCB, wherein the temperature is determined by voltmeter 450.
The TC system 1400 of FIG. 14, for example, like the system 1300 of FIG. 13 uses a screw terminal strip comprising semi-compensating conductive material combinations in the screws and terminal conductors to compensate the cold junction of the TC system. In this exemplary system 1400, three portions exist: a TC portion 1460, a screw terminal conductor portion 1470, and a PC board CJC portion 1475.
Using the temperature differentials indicated as before, and the TC materials and conductor materials of the semi-compensated system of FIG. 14, the EMF produced in each section is as follows:













Area
Material
Temp differential
EMF







TC Portion
K
T1 + T2 = (100 − 25)° C. = 75° C.
=3.096 mV


Screw TS
Cu/Ni
T3 = (25 − 20)° C. = 5° C.
=0.112 mV


conductor


PCB CJC
CJC
T4 = (20 − 0)° C. = 20° C.
=0.798 mV


Portion







TOTAL =
=4.006 mV









Since a type K thermocouple produces 4.006 mV due to thermal EMFs representing 97.5° C. while the actual temperature is 100° C., there is an error of only 2.5° C. produced by the semi-compensated TC system of FIG. 14 (which is the same as in FIG. 7), having at least two material inhomogeneities 1427 and 1437 after the TC measurement junction 405. The semi-compensated system 1400 is still less expensive than that of the fully compensated system 400 of FIG. 4, or that of system 700 of FIG. 7, but only produces one quarter of the error of the uncompensated system 500 of FIG. 5.

Although the invention has been illustrated and described with respect to one or more implementations, equivalent alterations and modifications will occur to others skilled in the art upon the reading and understanding of this specification and the annexed drawings. In particular regard to the various functions performed by the above described components (assemblies, devices, circuits, systems, etc.), the terms (including a reference to a “means”) used to describe such components are intended to correspond, unless otherwise indicated, to any component which performs the specified function of the described component (e.g., that is functionally equivalent), even though not structurally equivalent to the disclosed structure which performs the function in the herein illustrated exemplary implementations of the invention. In addition, while a particular feature of the invention may have been disclosed with respect to only one of several implementations, such feature may be combined with one or more other features of the other implementations as may be desired and advantageous for any given or particular application. Furthermore, to the extent that the terms “including”, “includes”, “having”, “has”, “with”, or variants thereof are used in either the detailed description and the claims, such terms are intended to be inclusive in a manner similar to the term “comprising.”

## Claims

1. A thermocouple system, comprising:
a thermocouple portion having a thermocouple defined by two thermocouple conductors with each composed of a different thermoelement material, said conductors joined to form a hot junction;
a semi-compensation portion having a conductor pair, wherein each conductor of the pair is coupled in series with a separate one of the thermocouple conductors and at least one of the semi-compensation conductors is composed of a material different than the thermoelectric material of the serially coupled thermocouple conductor;
a cold junction compensation portion having a conductor pair, wherein each cold junction conductor is composed of the same material, and each is coupled in series to a separate one of the semi-compensation conductors and wherein at least one of the semi-compensation conductors is composed of a different material than the material of the two cold junction conductors; and
a cold junction formed by the coupling of the semi-compensation conductors and the cold junction conductors; said semi-compensation conductors configured to provide a partial compensation EMF to a thermocouple EMF developed at the cold junction.

2. The thermocouple system of claim 1, further comprising an electrically insulating connector housing for holding and positioning the semi-compensation conductors in relation to and in contact with the cold junction conductors.

3. The thermocouple system of claim 1, further comprising a temperature sensor positioned near the cold junction for measuring the temperature of the cold junction.

4. The thermocouple system of claim 3, further comprising an electrical circuit board adapted for mounting the cold junction conductors, an electrically insulating connector housing, and the cold junction temperature sensor.

5. The thermocouple system of claim 3, wherein the temperature sensor comprises one of an RTD, a thermistor, a diode, a transistor, and an IC chip sensor.

6. The thermocouple system of claim 1, wherein the semi-compensation portion comprises a screw terminal strip for electrical interconnection between the thermocouple conductors of the thermocouple portion and the cold junction conductors of the cold junction compensation portion.

7. The thermocouple system of claim 6, further comprising an electrical circuit board for mounting the cold junction conductors, the screw terminal strip, and a cold junction temperature sensor.

8. The thermocouple system of claim 1, wherein the conductors of the semi-compensation pair are configured to develop a voltage for compensation at the cold junction that is associated with the voltage developed by the thermoelectric materials of the thermocouple portion.

9. The thermocouple system of claim 1, wherein the thermocouple portion further comprises a coupling conductor pair, each coupling conductor serially coupled between one of the thermocouple conductors and one of the semi-compensating conductors, wherein at least one of the coupling conductors is composed of a material different than the thermoelectric material of the coupled thermocouple conductor.

10. The thermocouple system of claim 9, wherein the coupling conductors are configured to develop a voltage for compensation at the cold junction that is associated with the voltage developed by the thermoelectric materials used in the thermocouple conductors.

11. The thermocouple system of claim 9, wherein the coupling conductors and the semi-compensation conductors comprise electrical pins.

12. The thermocouple system of claim 11, wherein the electrical pins for the coupling conductors comprise male pins, and the electrical pins for the semi-compensation portion comprise female pins wherein electrical and mechanical engagement and alignment are provided therebetween.

13. The thermocouple system of claim 11, wherein the electrical pins for the coupling conductors comprise female pins, and the electrical pins for the semi-compensation portion comprise male pins.

14. The thermocouple system of claim 1 wherein the semi-compensated portion includes a conductor pair having a material composition pairing selected from the group consisting of palladium/platinum, aluminum/nickel, copper/nickel, gold/nickel, and iron/nickel.

15. The thermocouple system of claim 1 wherein the thermocouple portion includes a first conductor of KP and a second conductor of KN, and the semi-compensation portion includes a first conductor including copper and a second conductor including nickel, and the cold junction compensation portion includes copper.

16. The thermocouple system of claim 15 wherein the second conductor is nickel plated.

17. The thermocouple system of claim 1 wherein the thermocouple portion is selected from the group consisting of types J, T, K, and S, and the semi-compensation portion having a first conductor including gold and a second conductor including nickel, and the cold junction compensation portion includes copper.

18. The thermocouple system of claim 17 wherein at least one of the first conductor is gold plated and the second conductor is nickel plated.

19. The thermocouple system of claim 1 wherein the thermocouple portion is selected from the group consisting of types J, T, K, and S, and the semi-compensation portion having a first conductor including copper and a second conductor including nickel, and the cold junction compensation portion includes copper.

20. The thermocouple system of claim 19 wherein the second conductor is nickel plated.

21. The thermocouple system of claim 1 wherein the semi-compensation portion further comprises a coupling conductor pair, each coupling conductor serially coupled between one of the thermocouple conductors and one of the semi-compensating conductors, wherein each of the coupling conductors is composed of the same material as each of the serially coupled semi-compensation conductors and at least one of the coupling conductors is composed of a material different than the thermoelectric material of the coupled thermocouple conductor.

22. The thermocouple system of claim 9 wherein at least one of the coupling conductors is composed of a different material than the material of the serially coupled semi-compensating conductor.

23. An electrical pin set for a pair of thermocouples wherein a first thermocouple is of a different thermocouple type than a second thermocouple, the pin set comprising:
two elongated metallic conductor pairs, each pair of conductors serially coupled to a different one of the thermocouples, each pair having two conductors composed of different metals carried within an electrically insulated mating connector housing, through which each conductor comprises a male pin positioned to project from the connector housing, wherein each male pin mechanically engages within an electrically conductive aperture comprising a corresponding female pin of a second connector housing associated with a cold junction of each of the thermocouples, and providing an electrical interconnection therebetween; and
wherein at least one of the metallic conductors of each elongated conductor pair is composed of a metal that is different than the thermoelectric materials employed in the serially coupled thermocouple, and wherein the different metals of each elongated metallic conductor pair are configured to provide a partial compensation EMF to a thermocouple EMF developed between a hot junction and cold junction of each serially coupled thermocouple.

24. The pin set of claim 23, wherein the metals of the elongated metallic conductors are selected to develop a voltage for compensation at the cold junction of the serially coupled thermocouple that is associated with voltage developed by the serially coupled thermocouple.

25. The pin set of claim 23 wherein at least one of the metallic conductors of each conductor pair is composed of a metal that is different than a metal of the corresponding female pin.

26. The pin set of claim 23 wherein the two conductors of each pair of elongated metallic conductor pairs that are configured to provide the partial compensation are composed of a conductor pair having a material composition pairing selected from the group consisting of palladium/platinum, aluminum/nickel, copper/nickel, gold/nickel, and iron/nickel.

27. The pin set of claim 23 wherein the elongated metallic conductors include a first conductor including copper and a second conductor including nickel, at least one of the thermocouples is a type J thermocouple having a KP and a KN conductor, and the elongated metallic conductors are serially coupled to a pair of cold junction conductors including copper.

28. The pin set of claim 27 wherein the second conductor is nickel plated.

29. The pin set of claim 23 wherein the elongated metallic conductors include a first conductor including gold and a second conductor including nickel, the thermocouples are selected from the group consisting of types J, T, K, and S, and the elongated metallic conductors are serially coupled to a pair of cold junction conductors including copper.

30. The pin set of claim 29 wherein at least one of the first conductor is gold plated and the second conductor is nickel plated.

31. The pin set of claim 23 wherein the elongated metallic conductors include a first conductor including copper and a second conductor including nickel, the thermocouples are selected from the group consisting of types J, T, K, and S, and the elongated metallic conductors are serially coupled to a pair of cold junction conductors including copper.

32. The pin set of claim 31 wherein the second conductor is nickel plated.