NAT'L INST. OF STAND & TECH

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REFERENCE

NIST

PUBLICATIONS

NIST TECHNICAL NOTE 1326

U.S. DEPARTMENT OF COMMERCE / National Institute of Standards and Technology

{00

Theory and Measurements of

Radiated Emissions

Using a TEM Cell

G.H. Koepke

MX Ma

W.D. Bensema

Electromagnetic Fields Division

Center for Electronics and Electrical Engineering

National Engineering Laboratory

National Institute of Standards and Technology

(formerly National Bureau of Standards)

Boulder, Colorado 80303-3328

v<.'^^^'°'^o.

U.S. DEPARTMENT OF COMMERCE, C. William Verity, Secretary

Ernest Ambler, Acting Under Secretary for Technology

NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, Raymond G. Kammer, Acting Director

Issued January 1989
National Institute of Standards and Technology Technical Note 1326

Natl. Inst. Stand. Technol., Tech. Note 1326, 40 pages (Jan. 1989)

CODEN:NTNOEF

U.S. GOVERNMENT PRINTING OFFICE

WASHINGTON: 1989

For sale by the Superintendent of Docunnents, U.S. Government Printing Office, Washington, DC 20402-9325
Contents

Page

1

Introduction 1

2 Background 3

3 Mechanical Considerations 9

4 Electrical Measurements 16

5 . Concluding Remarks 18

6 . References 19

111

List of Figures

Figure Page

1. An arbitrary current source inside one half of a TEM cell 21

2. The device under test (DUT) is modeled by three equivalent

orthogonal electric and three equivalent orthogonal magnetic

dipoles 21

3. The six required orientations of the DUT inside a TEM cell 22

4. A simple dielectric cube and trough for positioning the DUT

inside the TEM cell. The DUT is mounted inside the cube 23

5. Two views of the dielectric positioner for use inside a TEM cell 24

6. The face and axis definitions of the cube at the initial

position 25

7. The cube position at the second measurement step 25

8. (a) Schematic representation of the 2 slots in the back wall

of the trough, "L" (left) and "R" (right). (b) The view along

the trough axis showing the schematic of a lifting pawl within

a slot. The three positions, initial (1), intermediate (2),

and final (3) are shown for each of the pawls moving in

slots "L" and "R" 26

9. Cube rotation, from the initial to the second measurement step,

caused by the three successively higher positions of both the

"L" and "R" lifting pawl actuators. This is defined as an "A"

rotation, which is 90° 27

10. Cube rotation, from the second to the third measurement

positions, caused by the three successively higher positions

of only the "R" actuator pawl. This is defined as a "B" rotation, which is 90°. The "L" actuator, and left

slot are omitted for clarity 27
11. Detail of one of the two slots cut in the cube wall to

engage the "R" lifting pawl needed for single actuator

rotators (type B) of the cube 28

12. Cube positions for measurement step numbers four, five,

and six 28

13. Cross -sectional view of a TEM cell showing the two cable

positions which occur as the cable rotates. Also shown

are the approximate electric and magnetic field lines

in the cell 29

14. Radiated emissions testing measurement system 30

15. A flow diagram of the measurement and analysis sequences. ...... 31

List of Tables

Table Page

1. Required measurement positions of the DUT inside the TEM cell.. 10

2. Sequence of measurement steps, cube position changes,

rotation types, and actuator sequencing for a complete cycle... 14

VI
Theory and Measurements of Radiated

Emissions Using a TEM Cell

Galen H. Koepke , Mark T. Ma, and William D. Bensema

National Institute of Standards and Technology

Electromagnetic Fields Division

Boulder. CO 80303

The transverse electromagnetic cell is widely used to

evaluate the electromagnetic characteristics of electrically

small devices. This paper reviews the theoretical basis for a technique to quantify the radiated emissions from any such device

in the cell. The technique is well suited to an automated test

system provided that the mechanical motions required can be

controlled by a computer. The difficulties associated with these

mechanical motions are discussed and possible solutions are proposed. The measurement technique is also expanded to include

multiple- frequency sources in addition to single- frequency

sources

.

Key words: automation; electrically small radiator; emissions;

measurements; TEM cell

Introduction

The transverse electromagnetic (TEM) cell is a device widely used for

establishing a known electromagnetic field for susceptibility testing, probe

and antenna calibrations, and other applications where a contained

electromagnetic environment is desired. The measurement procedures and the

merits and limitations of the TEM cell are well documented for these types

of tests [1,2,3,4]. The TEM cell is also capable of capturing the signals

radiated from a device under test (DUT) , and provided that the criteria for
using the cell are followed these emissions may be quantified completely

(total power and radiated power pattern) [5,6,7]. The cell is especially

useful for devices that emit very low- level signals because it provides

Isolation from the ambient environment that may mask the signals radiated by

the DUT.

The TEM cell is an enclosed coaxial structure and is used at

frequencies where only the fundamental TEM mode may exist, as its name

implies. The polarization of the TEM mode is fixed with respect to the cell

geometry. This characteristic is very convenient for small dipole- antenna

calibrations where the antenna can be carefully aligned with the well known

electric-field vector [3]. However, for more complex DUTs where the

response or radiation pattern is unknown, a single orientation gives

incomplete information. Single orientation information may be useful for

relative comparisons such as modifications for interference hardening or suppression of signal leakage from the device. However, to completely

characterize the radiation from a device, six orientations with respect to

the TEM field are required [5,6,7].

The National Institute of Standards and Technology (NIST) has developed

and experimentally verified a technique for complete characterization of

emissions from an unknown source using the TEM cell [5,6,7]. Section 2 of

this paper briefly reviews the theoretical basis and the mathematical

requirements of the technique. Section 3 examines the mechanical

requirements for positioning the DUT in the TEM cell along with the problems

associated with cables and defining the DUT. Section 4 discusses the

electrical measurements and the instrumentation associated with both singlefrequency and multiple- frequency measurements. The use of a computer system

for automation of the measurements and analysis of the data is also

mentioned. A short conclusion then follows.
2 . Background

The electric and magnetic fields generated by an arbitrary current

source located inside a waveguide will propagate along the guide both

forward (+) and backward (— ), as shown in figure 1. These electromagnetic

fields may be expressed as a summation of electric and magnetic basis

-(±) -(±) functions E and H describing the field structure of each mode that can

n n

°

exist within the guide. An expansion coefficient (amplitude) a or b is

associated with each basis function as follows

E^-'^=Ia E^^\ H^^^=Za H^^\ (la) ^ n n ' ^ n n ' ^ ^

E*^ ^= y b E^ \ and h^ ^= Y b ti^ \ (lb) ^ n n '^ n

These coefficients a and b may be calculated given a known current source, n n -^ °

and the power at either port of the waveguide can then be determined. The

calculation is immediately simplified by noting that the TEM cell is to be

used with only the dominant TEM mode (n = 0) , that the source must be

electrically small to reside in the cell, and that this small source is

placed at the center of the cell, z = (figure 1). In reality, however,

the current source for most emitters is unknown. The Lorentz reciprocity

theorem for perfectly conducting waveguide walls can then be applied to

relate the unknown current source represented by a combination of both

electric-dipole moment (m ) and magnetic-dipole moment (m ) to the

coefficients a- and b- [7,8],
2 (m^ + jk M) (2a)

2 (m^ - jk M) (2b)

where e_ is the normalized transverse vector electric field inside the TEM

cell, M = m X z , z is the unit vector along the longitudinal axis of the

TEM cell, and k is the free -space wave number. Physically, e_ is the

fundamental -mode field generated at z = when a power level of 1 watt is

supplied to the TEM cell. For a well-constructed rectangular TEM cell, the

field component parallel to the flat center conductor (septum) near the

center of the cell will be very small and a good approximation for e_ is

given by

eo - q y TZ^ / b y

= 50 / b y . (2c)

where y is the transverse unit vector perpendicular to the septum, Z_ is

the impedance of the TEM line at z=0 (50 ohms), P is the power supplied to

the cell (1 watt), and b is the separation distance (meters) in the y

direction from the septum to the outer wall of the cell. Thus, e„ is known

for a given cell. The unknowns memand m in (2a) and (2b) are given by

m = J di

e m = J ' ds m

(2d)

where J is a normalized filament current, di is the directed length vector

of the short dipole, J' is the normalized loop current, and ds is the vector
loop area. The units for m are in ampere-meter normalized with respect to

a unit current (or meter) and for m are in ampere-meter-squared normalized

with respect to a unit current (or meter-squared). Clearly then, the units

for a_ and b^ are in volts.

The dot product of e_ and the source terms given in (2a) and (2b)

describes the coupling mechanism into the TEM mode in the cell and also

illustrates the reason the values of a_ and b^ are sensitive to the

orientation of the source in the cell.

A device (source) consisting of an arbitrary number of small electric

dipoles and small magnetic dipoles can be modeled, through the principle of

superposition, by three equivalent small orthogonal electric dipoles and

three equivalent small orthogonal magnetic dipoles, as shown in figure 2.

From the analysis point of view, once the amplitude and relative phase of

these equivalent dipoles are specified, the radiation pattern and total

power radiated may be calculated [7]. When the source parameters are unknown, as in the case of emissions from an arbitrary device, the

amplitudes (a and b_) of the fields generated by the source are readily

measured at the output ports of the TEM cell. The problem then involves

determining the equivalent source dipoles from measured data. The

expressions ^ of a_ and b. in (2a) and (2b) to the dipole moments m and M

e suggest that a simple addition and subtraction of a_ and b,^ will separate

the contribution of the electric-dipole and magnetic-dipole moments. The

powers detected at the output of the device performing the addition and

subtraction (for example a 0° and 180° hybrid junction) are then given by
for the sum power, and

for the difference power. Thus, the sum power relates only to the electricdipole moments and the difference power relates only to the magnetic-dipole

moments. A glance at the relative amplitude of these measurements will

indicate the source type (electric or magnetic or both)

.

The unknown dipole moments in (3a) and (3b) are, in general, composed

of three orthogonal components each. To determine the amplitude and phase

of each component requires a set of unique equations which can be solved

simultaneously. The necessary equations are developed by a series of six

orientations of the device within the TEM cell. The sum and difference

powers and the relative phase between the sum and difference ports are measured at each of the six orientations. The phase angle measurement is

required, as can be seen later, to develop the radiation pattern for a device composed of both electric and magnetic sources [7]. Phase

measurements can be omitted when the device is composed of only electric or magnetic sources (but not both) , or when the only quantity desired is the

total power radiated. The details and derivations of the equations needed

to calculate the source characteristics, including the treatment of the

phase information, have been presented in [ 7 ]

.

The unknown dipole-moment amplitudes, m , and m , (h = x,y,z) and

eh mn relative phases between the same kind, V* i ~ i> -^ , and \b , — V" i (h,h' =

^ eh eh' mh mh'

x,y,z; h 5^ h') can be computed by the detected sum power P . and difference

power P at the i-th DUT orientation (i = 1,2,..., 6) as follows [7],

m^ =(P,+P_-P_-P,+P^+P ,)/(2q^) (4a) ex si s2 s3 s4 s5 s6 ' ^
m^ =(P^+P-+P„+P.-P^-P ,)/(2q^)

ey si s2 s3 s4 s5 s6

(4b)

m^ =(-P^-P„+P„+P.+P^+P ,)/(2q^)

ez si s2 s3 s4 s5 sb

(4c)

xs? = (P,^ + P,_ - P,„ - P., + P., + P,,)/(2k^q^) mx dl d2 d3 d4 d5 db ' (4d)

% =

(^dl " ^d2 -^ ^d3 -^ ^d4 -^d5 - Pd6)/(2k'q') (4e)

TML =

(-^dl - Pd2 -^ ^d3

-^ Pd4 -^ Pd5 ^ Pd6>/(2k2q2) (4f)

V- - V- = cos'-^((P , - P _)/(2q^m m )) ex ey si s2 ex ey

(4g)

V- - V = cos"-^((P „ - P .)/(2q^m m ))

ey ez s3 s4 ^ ey ez

(4h)

V> - V- = cos'-^((P ^ - P .)/(2q^m m )) ez ex s5 s6 ' ^ ez ex

(41)

V- - V = cos"-'-((P,^ - P,.)/(2k^q^m m )) mx my d2 dl^ ^ mx my

(4j)

V- - V- = cos'-^((P,. - P,-)/(2k^q^m m )) my mz d4 d3^ ^ my mz

(4k)

V- - V = cos"-^((P,, - P^J/(2k^q^m m )) mz ^mx d6 db ' ^ mz mx

(4i)
where q is the previously defined y component of e_ [eq.(2c)]. The

corresponding free-space radiation pattern of this emitter, in spherical

coordinates referenced to the emitter center, can be expressed as

^{e,<i>)

IStt 2.2

r A

2 2 2 2 2 2 (m + k m ) (cos 8 cos 6 + sin (h) ex mx 222 22 2 222 2 + (m + k m )(cos 9 sin (h + cos 6) + (m + k m ) sin 9 ey my ez mz

2 2 — 2{m m cos(ib — tb ) + k m m cosCV" — V' )) sin 9 sind) cosd) ex ey ex ey mx my mx my

2{m m cos(ib — il) ) + k m m cos(xb — ih )) sin^ cos^ sin^

ey ez ey ez my mz my mz

2{m m cos(ih — lA ) + k m m cos(th — i/) )) sin^ cos^ cos^

ez ex ez ex mz mx mz mx

+ 2k{m m sin(jh — ih ) — m m sxrxiib — ih )] cos( ex my ex my ey mx ey mx

+ 2k{m m sinCth — ih ) — m m siniil) — ih )) sin9 cosd)

ey mz ey mz ez my ez my

+ 2k{m m sin(-d) — tl) ) — m m sin(-il) — il) )} sin^ sind) ez mx ez mx ex mz ex mz

(5)

where the relative phases between the different kind of dipole moments,

Tp . —01, can be computed by P . , P,. and the detected relative phase

eh mh' -^ si di

(<f) . , i=l , 2 , ... ,6) between the two output ports [7] . One of them is

specifically shown below:
ex my 1

m sin (lb — 4> ) ey ex ey m + in cosCV) — ip ) ex ey ex ey

— tan

-1 m cos(il) — V* ) — m

mx mx. my my

m sin (tJ) - il> ) mx mx my

(6)

The total power radiated can be obtained by

V = I

P. = V(9,<f>)dn

407 2 2 2 2 2 2 2 m +m +m +k(m +m +m) ex ey ez mx my mz

(7)

The above equations show that the relative phase information (f>

. is not

needed if the unknown emitter is believed to be composed of one kind of

dipole moments only (either n

given in (5) is not required,

dipole moments only (either memor m ) or if the detailed radiation pattern

Mechanical Considerations

A systematic procedure has been developed [5,6,7] using the rectangular

Cartesian coordinates and six DUT orientations to satisfy the need as outlined in section 2. The details of the positioning are illustrated in

figure 3 and the six required positions are listed in table 1. The
coordinates (x' , y' , z') are defined with respect to the DUT . The TEM cell

coordinates (x, y, z) are fixed with respect to the cell with z along the

length and x and y defining the transverse plane or cross section of the

cell. The y coordinate is perpendicular to the flat septum and x is

parallel to the septum. The cell coordinate system has its origin at the

geometric center of the TEM cell and the DUT is placed at (0, y , 0) (see

figure 3) . The coordinates of the DUT are aligned with the appropriate TEM

cell axes. This preliminary alignment as shown in figure 3 is then followed

by two successive rotations about the z axis (longitudinal) of the TEM cell.

The resulting positions are summarized in table 1.

Table 1. Required measurement positions of the DUT inside the TEM cell

POSITION Align DUT to cell axes then ROTATE about z

1 x' ->• X, y' -> y, z' -» z 45 degrees

2

" " " 135

3 y'->'X,z'-*y,x'->-z 45 " 4

" " " 135 "

5 z'->-x,x'->y,y'-+z 45 "

6

" " " 135

An appropriate rotatable mechanism for mounting the DUT inside the TEM

cell half-chamber must be fabricated. This mechanism may be as simple as the 90-degree non-metallic trough and cube shown in figure 4 where the DUT

is placed inside the cube and the trough holds the cube at the correct

position. This requires manual positioning at each of the six required

positions but is simple, accurate, and inexpensive.

10
A more sophisticated approach has been prototyped that allows for

automation of the mechanical rotation process using a similar cube for

mounting the device and a 90 -degree trough with pawls that lift and turn the

cube in the trough. The measurement positions as defined in table 1 are unchanged but the sequence of attaining each position has been tailored

(1,2,5,6,3,4, and return to 1) in order to minimize the mechanical movements

required of the rotator system and to avoid twisting cables which may be

parts of a DUT. The following description will refer to this sequence of

positioning as measurement steps and the actual orientation of the DUT in a particular step as a measurement position using the definitions of table 1.

Design of a mechanical rotator for the DUT in a TEM cell is limited by

several constraints:

1. Construction must be of dielectric (non-metallic) material.

2. Mass of the dielectric material must be kept to a minimum.

3. Positioning to each of the six positions must be accurate and

repeatable , independent of the mass distribution of the DUT.

4. Any power or data cables must not be allowed to tangle or twist.

5. Ideally, power or data cables should be maintained in a constant

configuration throughout the rotations.

6. The mechanism must be reliable. To this end the number of

actuators should be kept to a minimum. Two or three is ideal.

7. Finally, feedback to a controlling computer should be available to

tell the computer that each test position has been successfully

11
reached. Once the metal walled TEM cell is closed, visual

feedback is eliminated.

The mechanical system described here satisfies all these conditions. A

working prototype has been constructed that provided for all the above

points except number 7, and a suggested approach to accomplish that will be

described. The physical dimensions of the hardware are not specified. These

dimensions will be determined by the physical size of the TEM cell and the

devices placed in the cube. The center of the DUT should rotate about the

point midway between the septum and outer wall of the TEM cell.

The positioner consists of a dielectric cube, containing the DUT

mounted firmly inside and resting in a 90-degree dielectric trough that has

convex end plates (figure 5). Flat end plates were used in the prototype

and worked satisfactorily; slightly convex end plates would improve

reliability.

To progress from one measurement step to the next, a 90-degree rotation

of the cube about an axis projecting perpendicularly from a cube face is

performed. Axis definition is most easily defined as projecting from three

adjacent cube faces as shown in figure 6. The corner common to these three

faces is labeled "C" , and is delineated in all appropriate figures by a closed triangular mark. The axis definitions are not reproduced on the

remaining figures.

The first change of position (position 1 to 2) is a 90-degree rotation

of the cube about the z axis producing the orientation shown in figure 7.

Motion is accomplished by force from two actuators that each moves a single

pawl upward in a slot on the back face of the trough. The slots are labeled

"L" (left) and "R" (right), and are shown schematically in figure 8(a). The

actuators and attached pawl can be controlled individually. Figure 8(b)

shows the sequence of motion performed by either actuator/pawl combination.

12
The cube is rotated by the upward motion of the pawl/actuator

mechanism. The view down the z axis is shown in figure 9, for three

successive locations of both "L" and "R" pawls. After the cube reaches the

approximate position shown in figure 9(c), gravity causes the cube to fall

to the bottom of the trough. The sides of the trough and end walls are covered with a low friction material such as fluorocarbon to facilitate this

settling action. Because the sides of the trough are constructed to allow

for just the width of the cube, the cube is automatically centered as it

settles to the bottom of the trough. This type of axis rotation is

arbitrarily defined as an "A" rotation. At the completion of the A

rotation, the actuators are returned to their starting position. On the

trip down, the pawls rotate out of the way of the cube.

The system is now ready to begin the transition to the third

measurement step (position 5) , a maneuver defined as a "B" rotation. This

is accomplished by raising only one actuator, in this case the "R" actuator.

The motion produced is shown in figure 10. When the cube reaches the

position shown in figure 10(c) , gravity causes the cube to slip until face

y' contacts the right-hand end wall, and the cube falls into the bottom of

the trough, again centered by the confining walls. In order to maintain

engagement of the actuator to the cube as shown in figure 10 to the end of

the actuator travel, a semicircular slot is cut in the wall of the cube as detailed in figure 11. A total of 5 of these cuts will be needed; two on

the "right" for "B" rotation, and three on the "left" for rotation type "C"

to be discussed later.

Thus far we have followed the cube through three measurement steps

(positions 1,2, and 5). From step three (position 5), shown approximately

in figure 10(c) , step four (position 6) is reached by engaging both

actuators; step five (position 3) by another right actuator only, and step

six (position 4) by a third activation of both L and R. Figure 12(a), (b)

and (c) show the cube position for measurement steps four, five, and six.

13
After the measurement in step six is completed, the cube needs to be

returned to the starting position (position 1) for tests at aiiother

parameter, such as a different frequency. This could be accomplished by a simple "B" rotation using actuator "R" . However, this will give any cable

attached to the cube a 360-degree twist. Activation of the "L" actuator

three times in sequence will return the cube to the starting position

without twisting the cable. The "L" actuator above produces a 90-degree

turn about the same axis as a "B" rotation, but in the opposite direction.

This is arbitrarily defined as a "C" rotation. Three "C" rotations (not

shown in a figure) will return the cube to the starting position, as shown

in figure 6. Table 2 summarizes the sequence of cube rotation types and the

actuator-activation sequence. This sequence will need to be programmed on a controlling computer.

Table 2. Sequence of measurement steps, cube position changes, rotation

types, and actuator sequencing for a complete cycle

STEP POSITION TRANSITION CUBE ROTATION ACTUATOR

NUMBER From To TYPE ACTIVATION

unwinding

unwinding

return to 1

A

B

A

B

A

C

C

C

L R

R

L R

R

L R

L

L

L

There are devices designed to be self-contained and battery-operated,

including a spherical-dipole radiator used to verify this technique [7].

14
This class of radiators present few problems in performing this type of

measurement. However the majority of devices that require characterization

are not so simple. Most devices require interconnections to a larger system

or, at a minimum, connection to a power source. Any metallic cables

complicate measurements. Whenever possible these connections should be done

with fiber-optic or high- resistance lines which have a minimal perturbation

on the electromagnetic field.

Two significant issues to deal with in performing radiated measurements

on devices and their associated cabling are defining what constitutes the

DUT and controlling the effects of that part of the system external to the

defined DUT. These issues and others are addressed in [1] for typical

susceptibility measurements at a fixed orientation in the TEM cell. The DUT

is carefully positioned in the TEM cell and the excess cable lengths are concealed using metal tape or removed from the cell as much as possible.

The multiple orientations of this technique, however, require that the

DUT remain essentially the same for each position and the effect of the

connecting cables also remain constant. The sequence of rotations outlined

in table 2 makes it possible to handle equipment cables without tangling or twisting, to minimize the change in the nature of the DUT, and to control

the effects of the cabling on the TEM field. By inserting the power or other instrumentation cable at the corner labeled "C" in figures 6, 7, 9,

10, and 12, the problem of cable handling is simplified. First, as can be

discerned by studying these figures, the cable will be in one of only two

possible positions while the cube is in any of its six measurement

positions. Figure 13 shows these two positions. It also shows the

approximate electric-field and magnetic-field lines present in a TEM cell

with a square cross section. A wide rectangular cross section would provide

a more uniform field in the test region at the center of each half- space and

a lower concentration of the field in the septiom to sidewall gap region. If

it were possible to always align the interconnecting cables to cross the

15
electric-field lines perpendicularly, the effects on the TEM field would be

minimized. No matter where the cabling exits the TEM cell, it must cross the same potential difference, so the choice is only how the exposure is

distributed along the length of cable. In general, the cables are going to

have an effect on the TEM field and also on the definition of the DUT . To

the extent that these effects can be estimated, they should be accounted for

when calculating the source parameters or at least brought into the error

estimations as detailed in [9]. Figure 13 shows a suggested contour for

each of the two positions of the cable during measurement.

The details of the mechanical actuators used in the prototype

construction to lift the two pawls have been left out. In practice, a third

actuator to raise a "catcher bar" located in the center of the trough

between slots "L" and "R" is desirable to prevent the cube from experiencing

sudden accelerations during descent.

Completion-of -motion feedback to a controlling computer can be provided

by a fiber-optic light path that is either interrupted or completed when the

cube has settled into measurement position. More elegant feedback that

identifies the status of the possible positions can be implemented with

three fiber-optic loops and appropriate binary coding applied to the eight

cube edges that appear in the trough bottom through the complete cycle.

Electrical Measurements

The instrumentation requirements for this measurement may be grouped

according to three test requisites. The first type of test is a complete

characterization of the DUT at a single frequency including both radiation

pattern and total power radiated. The second and less demanding test is

where the total power radiated is desired but the radiation pattern is not.

16
This requires only amplitude measurements and is a subset of the first test

type. The third test requirement relates to those DUTs which have a v/ide

spectrum of emissions (i.e. digital circuits) and a complete

characterization at each frequency is not practical. In this case amplitude

measurements are made using a spectrum analyzer.

The measurement system includes the TEM cell, a sum and difference

device, a detection instrument such as a vector analyzer, power meters, or spectrum analyzer, and a computer. The interconnecting coaxial cables must

be carefully matched for electrical length and the signal path completely

calibrated for losses and phase shifts. The TEM cell and the sum and

difference device are selected based upon the frequency range of interest.

In addition, the TEM cell must be large enough to accommodate the DUT. This

will impose frequency constraints on the measurement [1]. A simple way to

perform the sum and difference operation is with a 0° and 180° hybrid

junction. These devices perform well and are available for frequencies

above approximately two hundred kilohertz. When the desired frequencies

fall below this or when the level of emissions is low and requires some amplification, the sum and difference function can be performed with an active circuit using operational amplifiers and other discrete components.

Figure 14 is a block diagram of a typical measurement system. A vector

analyzer is required to measure the relative phase between the sum and

difference ports, in addition to the amplitudes, for those tests requiring a complete characterization as noted in the first requirement above. The

vector analyzer may be replaced with power meters or a coaxial switch and

spectrum analyzer (for amplitude measurements only) if the radiation pattern

is not desired. A word of caution in using the vector analyzer or power

meters for devices that emit more than a single frequency signal is that the

vector analyzer used in the tests presented in [7] and power meters in

general do not discriminate against signals at frequencies other than the one under test and may give distorted results. These instruments should be

17
used with devices that exhibit single frequency emissions. When the test

plan requires a complete characterization and the signal from the DUT

contains multiple frequencies, it may be necessary to use a pre-selector or bandpass filter prior to the vector analyzer to select the desired

frequency. A phase -amplitude receiver may be an alternative, if available

in the desired frequency range.

The measurement becomes simpler when the phase requirement is removed.

The sum and difference amplitudes may be measured by power meters or a spectrum analyzer. The power meters are less expensive and typically more accurate than a spectrum analyzer; however a power meter will respond to all

frequencies present, and gives distorted results. There are some advantages

to using a spectrum analyzer instead of power meters, such as increased

dynamic range and the ability to distinguish specific frequencies. The

spectrum analyzer may also be used to concurrently perform amplitude

measurements at each of the many frequencies within the frequency- span

setting of the instrument for a single series of mechanical rotations. This

is essential for those devices containing a wide spectrum of emissions and

very useful for any multiple -frequency device because the frequencyselection mechanism is contained in the spectrum analyzer.

The measurement sequence and data-analysis process are diagrammed in

figure 15 to aid in development of a computer program designed to implement

this technique. Figure 15 shows the various options for performing the

measurement and processing the data that have been discussed.

5 . Concluding Remarks

The TEM cell can be a powerful tool in the evaluation of

electromagnetic properties of electrically small devices. The theoretical

18
basis for complete characterization of an unknown emitter has been developed

earlier. This paper has explored some of the practical problems in the

implementation of this measurement procedure. Suggestions to solutions for

handling the interconnecting cables and automating the mechanical rotation

process have been presented. This information along with the mathematical

details in [7] and [9], and good measurement practice should enable this

technique to be an efficient and useful tool for the study of radiated

emissions from a wide variety of devices.

6 . References

[1] Crawford, M. L. ; Workman, J. L. Using a TEM cell for EMC

measurements of electronic equipment. NBS Tech Note 1013, July

1981.

[2] Crawford M. L. Generation of standard EM fields using TEM

transmission cells. IEEE Trans. EMC, vol. EMC- 16, No. 4, pp.

189-195, Nov 1974.

[3] Kanda, M. ; Orr , R. D. Generation of standard electromagnetic

fields in a TEM cell. NBS Tech Note 1319, July 1988.

[4] Sreenivasiah, I.; Chang, D. C; Ma, M. T. A method of

determining the emission and susceptibility levels of

electrically small objects using a TEM cell. NBS Tech Note

1040, April 1981.

[5] Sreenivasiah, 1.; Chang, D. C; Ma, M. T. Characterization of

electrically small radiating sources by tests inside a transmission line cell. NBS Tech Note 1017, Feb 1980.

[6] Sreenivasiah, I.; Chang, D. C; Ma, M. T. Emission

characteristics of electrically small radiating sources from

tests inside a TEM cell. IEEE Trans. EMC, vol. EMC-23, No. 3,

pp. 113-121, Aug 1981.

[7] Ma, M. T. ; Koepke , G. H. A method to quantify the radiation

characteristics of an unknown interference source. NBS Tech

Note 1059, Oct 1982.

19
[8] Collin, R. E. Field Theory of Guided Waves, New York, McGrawHill Book Company, 1960.

[9] Ma, M. T.; Koepke, G. H. Uncertainties in extracting radiation

parameters for an unknown interference source based on power and

phase measurements. NBS Tech Note 1064, June 1983.

20
E--

C

-*E +

2 =

Figure 1. An arbitrary current source inside one half of a TEM cell

Figure 2. The device under test (DUT) is modeled by three equivalent

orthogonal electric and three equivalent orthogonal magnetic

dipoles

21
1mu

•sas

60 uo

a.coc

00uu

04

CMa

(duocI«u

04

mCoO

Ot co

SIo

CQo

04

Co

•HU

•H

COo

04 coo

04

CMeomo H

cd

•H

COCQ

0)o

COCo

CO •uC

0) •H

!-l O

•o

0)

J-l •H3

cr

0) H

22
a> •o•H«G

•HHPO

0) ,c

*JbOc

1-1 • c 9) XI

•H 3

4-)

O

1-1(0 Q) o ^

a. 4J

V4 0) o -o

U-i •!-l w J C

W) •r-t 3o •o u 0) u +Jc

•o 3 c O

CO

B

Qi

u

Xi •r-l 3o HP

CJ

Q •1-^ u (U

4-) J= O H

0) i-H • 0) r-l •H t-1 •o Q)O

a>

r-la § E H •HW 0) J5 < U 9u3

bO

23
Figure 5. Two views of the dielectric positioner for use inside a TEM cell,

24
x'axis-^ I ^X^ Corner "C"

x' face

?

zaxis

y axis z face

"/ face

Figure 6. The face and axis definitions of the cube at the initial position,

CornerX"

Figure 7. The cube position at the second measurement step,

25
Lifting

(b)

Figure 8. (a) Schematic representation of the 2 slots in the back wall of

the trough, "L" (left) and "R" (right).

(b) The view along the trough axis showing the schematic of a lifting pawl within a slot. The three positions, initial (1),

intermediate (2), and final (3) are shown for each of the pawls

moving in slots "L" and "R"

26
X axis /axis'X^

y axis

(c)

Figure 9. Cube rotation, from the initial to the second measurement step,

caused by the three successively higher positions of both the "L" and "R" lifting pawl actuators. This is defined as an "A" rotation, which is 90°.

Figure 10. Cube rotation, from the second to the third measurement

positions, caused by the three successively higher positions of

only the "R" actuator pawl. This is defined as a "B" rotation, which is 90°. The "L" actuator, and left slot are omitted for clarity.

27
Lifting force

exerted by

actuator "R"

lo

Figure 11. Detail of one of the two slots cut in the cube wall to engage the

"R" lifting pawl needed for single actuator rotators (type B) of

the cube

.

Corner "C"

(a) Step Four

(b)

Step Five

Figure 12. Cube positions for measurement step numbers four, five, and six.

28
&) CI <U (U c c

(U Si3u

u

(U CO o o <u O Ul 4.) woe

<U I—

X < W

4J 0) • C C <U r-(

1-1

U o -u n-i X O 0)

i-l (U O CO(J lUc

0) bO u e

CO tw CO

C o <o u > 3 O

0)O 1-1

1-1 o vj > O iJ

1-1

X <u

CO CJ .-t o x:

CO CO c a O -H w o

CJ

en

CJ

a CO

0)3

bO

29:

-M

Q cD — M ^ — IX)
and J 80°

Hybrid

junct J on

Sum port A Di -f-Ference port

i_L

Instrument at ion

for power and

phase measurement

Figure 14. Radiated emissions testing measurement system.

30
In i t I a / I ze s/s te.Ti

Soli tch

to sum

port, read sum power

Siiiitch to d I fference

part , read

d i fference

pCii-'Cr

Read

arnp I 1 tudes and phase on vector

ana 1 yzer

Compens ate for system

ca / ifar at ion and /osses

Calcul ate source

amp I i tude terms

\ f Select other

quadrants

for

Calcul ate source phase

arccos ine terms

i I

' r

NO

< cans 1

aseN. stent^

res

Ca /cu / ate total power

vs frequency

from spectrum

analyzer trace data and

gr ach resu I ts

Tabu I ate source parameters

and total power

r adi ated

Figure 15, A flow diagram of the measurement and analysis sequences.

31
NBS-114A (REV. 2-80) U.S. DEPT. OF COMM. BIBLIOGRAPHIC DATA

SHEET (See instructions)

1. PUBLICATION OR

REPORT NO. NIST/TN-1326

2. Performing Organ. Report No. 3. Publication Date

January 1989

4. TITLE AND SUBTITLE

Theory and Measurements of Radiated Emissions Using a TEM Cell

5. AUTHOR(S)

G.H. Koepke, M.T. Ma, and W.D. Bensema

6. PERFORMING ORGANIZATION (If joint or other tlian NBS, see instructions)

National Institute of Standards and Technology

DEPARTMENT OF COMMERCE

WASHINGTON, D.C. 20234

7. Contract/Grant No.

8. Type of Report & Period Covered

9. SPONSORING ORGANIZATION NAME AND COMPLETE ADDRESS (Street. City. State, ZIP)

10. SUPPLEMENTARY NOTES

Q21 Document describes a computer program; SF-185, FlPS Software Summary, Is attached.

11. ABSTRACT (A 200-word or less factual sunnmary of most significant information. If document includes a significant

bibliography or literature survey, mention it here)

The transverse electromagnetic cell is widely used to evaluate the

electromagnetic characteristics of electrically small devices. This

paper reviews the theoretical basis for a technique to quantify the

radiated emissions from any such device in the cell. The technique is

well suited to an automated test system provided that the mechanical

motions required can be controlled by a computer. The difficulties

associated with these mechanical motions are discussed and possible solutions are proposed. The measurement technique is also expanded to include

multiple-frequency sources in addition to single-frequency sources.

12. KEY WORDS fS/x to twelve entries; alphabetical order; capitalize only proper names; and separate key words by semicolons)

automation; eelectrically small radiator; emissions; measurements; TEM cell

13. AVAILABILITY

[3 Unlimited

Q For Official Distribution. Do Not Release to NTIS

[^ Order From Superintendent of Documents, U.S. Government Printing Office, Washington, D.C.

20402.

[2Z\ Order From National Technical Information Service (NTIS), Springfield, VA. 22161

14. NO. OF

PRINTED PAGES

40

15. Price

GPO 674-600/5033

USCOMM-DC 6043-P80



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