NAFL INST. OF STAND & TECH R.I.C.

AlllOS 3SMmE

isurement Services:

N!ST

REFERENCE PUBLICATIONS;

NIST Multifunction

Calibration System

NIST

Special

Publication

250^6

Nile Oldham and Mark Parker

U.S. Department of Commerce

Technology Administration

U57 National Institute of Standards and Technology

0.250-46

I 998 '
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'At Boulder, CO 80303. ^Some elements at Boulder, CO.
NIST Special Publication 250-46

NIST MEASUREMENT SERVICES:

NIST Multifunction Calibration System

Nile Oldham and Mark Parker

Electronic Instrumentation and Metrology Group

Electricity Division

Electronics and Electrical Engineering Laboratory

National Institute of Standards and Technology

Gaithersburg, MD 20899-0001

February 1 998

U.S. Department of Commerce

William M. Daley, Secretary

Technology Administration

Gary R. Bachula, Acting Under Secretary for Technology

National Institute of Standards and Technology

Raymond G. Kammer, Director

*
National Institute of Standards and Technology Special Publication 250-46

Natl. Inst. Stand. Technol. Spec. Publ. 250-46, 28 pages (Feb. 1998)

CODEN: NSPUE2

U.S. GOVERNMENT PRINTING OFFICE

WASHINGTON: 1998

For sale by the Superintendent of Documents, U.S. Government Printing Office, Waslnington, DC 20402-9325
TABLE OF CONTENTS

1. INTRODUCTION 2

2. DESCRIPTION OF THE MCS 3

2.1 MCS Hardware 3

2.2 MCS Software 4

3. CHARACTERIZING THE MCS 6

3.1 DC Voltage (DCV) 6

3.2 DC Current (DCI) 8

3.3 DC Resistance (DCR) 10

3.4 AC Voltage (ACV) 12

3.4.1 Voltages from 1 mV to 1 kV from 10 Hz to 1 MHz 12

3.4.2 Voltages from 1 mV to 250 mV from 10 Hz to 1 MHz 14

3.4.3 Voltage from 250 mV to 7 V from 10 Hz to 30 MHz 15

3.4.4 Voltages from 1 mV to 1 kV from 0.01 Hz to 1 kHz 16

3.5 AC Current (ACI) 17

3.5.1 Currents from 2 mA to 10 A from 10 Hz to 100 kHz 18

3.5.2 Currents from 2 mA to 10 A from 0.01 Hz to 1 kHz 20

4. CALIBRATIONS AND TESTS USEslG THE MCS 21

4.1 Calibration of DMMs Using the MCS Calibrator 21

4.2 Calibration of Calibrators using the MCS DMM 23

4.3 High Accuracy Special Test of DMMs and Calibrators 24

4.4 Special Test of Low Voltage Thermal Voltage Converters 24

4.5 Special Test of Micropotentiometers 24

5. QUALITY CONTROL AND UNCERTAINTIES 24

7. ACKNOWLEDGMENTS 25

8. REFERENCES 26

1
NIST MULTIFUNCTION CALIBRATION SYSTEM

Nile Oldham and Mark Parker

Electronic Instrumentation and Metrology Group

Electricity Division

National Institute of Standards and Technology

Gaithersburg, MD 20899

Abstract - The NIST automated Multifunction Calibration System (MCS) for voltage, current, and

resistance is described. Developed primarily to calibrate digital multimeters and calibrators, the

system can also be used to test thermal converters, and micropotentiometers. Methods for

characterizing the MCS over a wide range of amplitudes at frequencies from dc to 30 MHz are described.

1. INTRODUCTION

Digital multimeters (DMMs) from a number ofmanufacturers claim uncertainties and stabilities that

approach those of the laboratory standards used to support them. This is possible because these

DMMs are essentially miniature standards labs with built-in zener references, stable resistors, and

ac-dc transfer standards, all controlled by a central processor that applies corrections and performs

data analysis. In addition to being easier to use than most standards, DMMs are also quite rugged,

able to withstand the mechanical and thermal shocks oftransportation from one laboratory to another

with little degradation in performance. These properties make them ideal transport standards to provide traceability for the five quantities that most DMMs measure (dc voltage, current, and

resistance, and ac voltage and current).

The National Institute of Standards and Technology (NIST) offers calibration services^ for dc

voltage, dc resistance, and the ac-dc difference ofthermal converters [ 1 -4] . With these three services,

standards laboratories can provide direct NIST traceability for the functions measured by most

DMMs. Based on customer demand, special tests^ for DMMs (all functions) were offered beginning

in 1990 [2-4]. This technical note describes the NIST Multifunction Calibration System (MCS) that

is used to provide special test services for DMMs, multifunction calibrators (the programmable

sources designed to calibrate DMMs), and special tests for low voltage thermal converters, and

micropotentiometers. The MCS is periodically calibrated using reference electrical standards

available at NIST. Results of these system calibrations and of frequently performed self-tests are analyzed statistically to maintain quality control of the MCS.

NIST calibration services are well documented and analyzed measurements offered at a fixed cost.

NIST special tests are generally undocumented measurements that are charged "at cost."

2
2. DESCRIPTION OF THE MCS

2.1 MCS Hardware'

A block diagram of the MCS instrumentation is shown in Fig. 1 . The basic system is quite simple,

consisting of a controller, a characterized calibrator (to test DMMs), and two characterized DMMs

(to calibrate calibrators and serve as check standards for the system calibrator).

Fig. 1 . Simplified diagram of the MCS.

The NIST test facility consists of two such systems which utilize the instruments shown in Table 1

Table 1 MCS Instrumentation

System 1 System 2

Fluke 5720A Multifunction Calibrator Wavetek 4808 Multifunction Calibrator

Hewlett Packard 345 8A Digital Multimeter Hewlett Packard 345 8A Digital Multimeter

Wavetek 4950 Digital Multimeter Wavetek 4950 Digital Multimeter

PC Controller with GPIB Card PC Controller with GPIB Card

Keithley 7001 Switch System Keithley 7001 Switch System

Commercial instruments and software are identified in this report to describe the measurement system.

Such identification does not imply recommendation or endorsement by NIST, nor does it imply that the instruments

or software are necessarily the best available for the purpose.

3
The system calibrator and DMMs are periodically characterized using the support equipment and

NIST reference standards shown in Table 2 and in Fig. 2.

Table 2

Support Equipment

Function Support Equipment and NIST Reference Standards

DC voltage

(DCV)

NIST 1 0 V Josephson array

Wavetek 491 1 10 V zener reference

Fluke 752 resistive voltage divider (0.1:1 to 100:1)

DC current

(DCI)

NIST standard resistors (0.1 Q to 100 MQ)

System DMM (DCV)

DC resistance

(DCR)

NIST standard resistors

System DMM (RES)

AC voltage

(ACV)

System calibrator (DCV)

NIST thermal voltage converters (0.1 V to 1 kV, 10 Hz to 100 MHz)

Ballantine 440 and Holt 12 micropotentiometers

(1 mV to 200 mV, 10 Hz to 30 MHz)

Wavetek 4920 ac digital voltmeter (1 mV to 200 mV, 1 Hz to 30 MHz)

NIST DSS-5 Digitally Synthesized Source (1 mV to 7 V, dc to 1 kHz)

Keithley 181 and 1 82 dc nanovoltmeters

Hewlett Packard 34420A nanovoltmeters

AC current

(ACI)

System calibrator (DCI)

NIST thermal current converters (2 mA to 20 A, 10 Hz to 100 kHz)

NIST DSS-5

NIST Transconductance Amplifier ; i, NIST ac resistors (0. 1 Q to 1 00 kQ) -

Instruments are controlled using a PC (486 or higher) and a National Instruments GPIB-PCIIA

general purpose interface bus (GPIB) interface card.

2.2 MCS Software ^^1^^ i-"' ^

--^

The systehi software, developed in National Instruments LabVlfeWTM, allows the operator to perform

all ofthe tests needed to characterize the system calibrator and DMMs, store and edit correction files,

and set up and perform tests of the instrument under test (lUT). Since the instrumentation is

4
10Hz - 30IVHZ 0.1 Hz - 1 kHz 10Hz - 100kHz

200rTV-1 kV 1 - 200rrV

"TT-ERMN. VOLTAGE COMzKlhRS

(TVC)

MCROPOTHvmOMETERS

(Mp)

1 nV - 7V

acrrALLY SmTl-ES12ED SOURCE

(DSS)

2rM - 20A

THERMflJ. CURRENT

OOTA/eTTERS

(TCQ

CONTRCXIB? AND

SOFTWARE

MULTIFUNCTION CALIBRATOR AND

AtVPURStS

V V V V

aaTAL

MULTIWETH^

(DMA)

INSmsJtJEtfVS

(CMVl DETECTOR m < SWITCHES. ETC.) AAA

JOSB=HSON ARRAY >

DC VOLTAGE RESISTIVE VOLTAGE DMDB%S

STANDARD

RESISTORS

QUANTIZED

RESISTANCE STANDARD > « €

0-10V 10 V 1:1000 -lOOai 0.01 Q- 100 Mn 6.4 kO

Fig. 2. Block diagram of MCS support equipment.

controlled through the GPIB, most tests can be completely automated, requiring an operator only to change connections between the calibrator and DMM for certain functions. Test data are numerically

processed using commercial spreadsheet software. In addition to the software developed at NIST,

the MCS also makes use of commercial software to control the 4950 DMM.

Table 3

A list of the software routines available in the MCS

Title Description

DMM cal Used to calibrate any of the ftanctions on a test DMM using

the MCS calibrator.

Calibrator cal Used to calibrate any of the ftinctions on a test calibrator

using one of the MCS DMMs.

Thermal V/I cal Used to calibrate the ac voltage and current ftinctions of

DMMs and calibrators using thermal converters.

DC V/I cal Used to calibrate the dc voltage and current functions of the

MCS calibrator and DMMs.

5
DCR Used to calibrate the resistance function of the MCS

caHbrator and DMMs.

AC-DC diff Used to determine the ac-dc difference of thermal

voltage/current converters and micropotentiometers.

4950MTS Software that uses a 4950 DMM to test a calibrator, and

store a new set of firmware corrections in Wavetek

calibrators.

3. CHARACTERIZING THE MCS

3.1 DC Voltage (DCV)

A Wavetek 4911 10 V zener reference is part of the MCS equipment used to support the DCV

fiinction of the system calibrator and DMMs. This instrument is periodically compared to the NIST

10 V Josephson array [5]. A control chart with the zener reference corrections is shown in Fig. 3.

3 1 ^2

-3 J '

0 50 100 150 200 250

Time (weeks)

o Measured -•- Regression

Fig. 3. Control chart with measured and predicted

corrections for the zener reference.

Periodically, special resistive dividers, a Fluke 752, and another similar divider designed at NIST,

are used to compare five calibrator voltages (100 mV, 1 V, 10 V, 100 V, and 1 kV) to the 10 V zener

reference. The dc voltage corrections to the calibrator C^^^^y are related to the calibrator setting S and

the actual calibrator output voltage F^^ck by:

Kvcv=S(l + C,,cv)- (1)

6
A control chart with selected calibrator corrections is shown in Fig. 4. Over long intervals, calibrator

corrections tend to drift linearly with time, so a least-squares fit to the correction time series is performed and a linear equation is used to predict the calibrator correction between calibrations.

0.5

0

-0.5

oU

-1 I 1.5

-2 I -2.5 + -f- -I- 4- +

12 16 20 24 30 34 38 42

Time (weeks)

O.I V (measured) O.I V (regression) o 10 V (measured) -•- 10 V (regression)

Fig. 4. Control chart with measured and predicted

corrections for the MCS calibrator for DCV.

The system DMMs are calibrated at 10 V directly against the zener reference and at other voltages

using the characterized calibrator. The DMM corrections C^^cf related to the DMMreading R and

the true voltage by:

Vj,c = RO + C,^cy)- (2)

The system calibrator and DMMs rely on an internal zener voltage reference and timing to generate

and measure voltage. The calibrator uses a scaling technique known as time-division-multiplexing,

while the DMMs employ multislope integrating analog-to-digital converters. Both techniques are capable of excellent linearity. The linearity of one ofthe system DMMs has been shown to be better

than 1 part in 10^ of full scale between 1 V to 10 V using the Josephson array [5]. The linearity of

other voltage ranges is measured using a calibrated DMM and resistive divider.

For both the calibrator and DMMs, calibration at fiill scale and 10% of full scale in each range is generally adequate to characterize the full range. The system software linearly interpolates between

calibration points to compute calibrator corrections over the full range (>1 0'' discrete voltages). These

software corrections are applied during the test of a customer's DMM. DMM corrections are processed in a similar manner and applied during the test of a customer's calibrator.

The uncertainty ofDCV measurements performed using the MCS depends on uncertainties computed

during the test (Type A) and uncertainties associated with the calibration of the MCS (Type B). A

7
description of these uncertainty types and methods of combining them is given in Section 5 and in

reference [6].

The Type B standard uncertainties ofthe MCS caHbrator for DCV are given in Table 4. These figures

include uncertainties associated with the DCV support equipment described in Table 2. The

uncertainties in Table 4 are for the set ofpoints where the MCS is routinely calibrated and monitored

(Calibrated Points) and for all other points within the range (Full Range) where corrections are interpolated estimates.

Table 4

MCS Type B Standard Uncertainties for DCV

Voltage Range Calibrated Points Full Range

1 mV to 100 mV 5 ^iVA^ + 1 ^V 10 |nVA^+ 1 |LiV

100 mVto 1 V 2 nVA^ + 1 [iV 4 \iV/W + 1 liY

1 V to 10 V 1 liW/V + 1 nV 2 [lY/W + 1 |iV

10 to 100 V 2 ^iVA^ 4 [lY/W

100 V to 1 kV 3 ^iVA^ 6 |nVA^

3.2 DC Current (DCI)

The DCI function of the MCS calibrator and DMMs is periodically calibrated by applying various

calibrator currents to a set ofNIST reference, four-terminal resistors and measuring the voltage across

the resistors using a system DMM. The set of reference resistors consists of values between 0.1 Q

and 1 MQ that are maintained in oil and air baths with a temperature control of ±0.1 °C, and are periodically calibrated against the NIST resistance standards [7].

To measure the influence ofcompliance voltage, calibrator currents are measured with the following

burdens:

a. reference resistor only,

b. reference resistor and each system DMM,

c. each system DMM only.

The compHance voltage is measured for each burden and the current differences vs compliance

voltage are plotted. If there is a significant difference, additional burden measurements are made to cover the expected range of customer's DMM burdens. Linear interpolation between data points is generally adequate to correct the calibrator current.

8
The dc current corrections to the cahbrator C^^ci ^re related to the caHbrator setting S and the actual

calibrator output current I^j^^., by:

IcDa=S(l + C,^„). (3)

The system DMMs are also calibrated at various currents by this procedure. The DMM corrections

CdDci related to the DMM reading R and the true current loc^yIoc = RO +C,^a)- (4)

A control chart with selected DCI calibrator corrections is shown in Fig. 5. DCI corrections tend to

drift linearly with time, so a least squares fit to the correction time series is performed and a linear

equation is used to predict the calibrator correction between calibrations. The system software also

linearly interpolates between calibration points to compute corrections over the fiill range. As with

DCV, software corrections are applied during DMM and calibrator tests.

40

35 'Sso

a

325

.2 20 og15

a 10

5

0 4- 4- + +

12 16 20 24 28 32 36 40

Time (weeks)

^ 1 0 mA (measured) 10 mA (regression) o 1 A (measured) -•- 1 A (regression)

Fig. 5. Control chart with measured and predicted

corrections for the MCS calibrator for DCI.

Measurements are performed at cardinal currents between 1 )nA and 10 A. Measurements at other

currents indicate that, for the calibrator and DMMs, the current linearity is generally as good or better

than the current stability. However, for measurement at other than the calibrated points, the MCS

corrections are interpolated estimates and uncertainties are somewhat larger. As with DCV, the

uncertainty ofDCI measurements performed using the MCS depend on Type A and Type B standard

uncertainties. The Type B standard uncertainties of the MCS calibrator for DCI (which include the

uncertainties of the DCI support equipment described in table 2) are given in Table 5.

9
Table 5

MCS Type B Standard Uncertainties for DCI

Current Range Calibrated Points Full Range

1 |a,A to 1 mA 20 |aA/A+ lOnA 40 |iA/A+ lOnA

1 mA to 10 mA 15 |iA/A 30 liA/A

10 mA to 100 mA lO^A/A 20 liA/A

100 mA to 1 A 20 [lA/A 40 [lAJA

1 A to 10 A 25 \iA/A 50 jiA/A

3.3 DC Resistance (DCR)

The DCR function ofthe MCS calibrator and DMMs is periodically calibrated against the set ofNIST

reference resistors described earlier. Each reference resistor is measured by the system DMMs using

the 4-wire DCR function. The dc resistance corrections to the DMM Q^ic^ are related to the DMM

reading R and the true dc resistance R^^ by:

R^c=RO + C,^cr)- ~ (5)

Once the DMMs are calibrated, they are used to measure the set of resistors in the system calibrator.

The corrections to the calibrator resistors are based on the average of values assigned by the system

DMMs. The dc resistance corrections to the calibrator Q^i^;? are related to the cahbrator setting S and

the actual calibrator dc resistance R^^cr by:

Kdcr =S(1 + C,^cr)- (6)

A control chart with selected DCR calibrator corrections is shown in Fig. 6. DCR corrections also

tend to drift linearly with time, so a least squares fit to the correction time series is performed and a

linear equation is used to predict the calibrator correction between calibrations. The system software

also linearly interpolates between calibration points to compute corrections over the full range

(DMMs only). As with other ftmctions, software corrections are applied during DMM and calibrator

tests.

Measurements are performed at nominal decade resistance values from 0.1 Q to 100 MQ using the

DMMs. Decade resistance values between 1 Q and 10 MQ are available on the system calibrator.

Other than decade values may be measured using the system DMMs, which demonstrate resistance

linearity as good or better than resistance stability. However, for measurement at other than the

cahbrated points, the MCS corrections are interpolated estimates and uncertainties are somewhat

larger. The Type B standard uncertainties of the MCS DCR (which include the uncertainties of the

10
DCR support equipment described in table 2) are given in Table 6.

4 T3

? 2-

-4 -M 1 1 1 1 1 1 1 1 1 1-

1 4 8 12 16 20 24 28 32 36 40

Time (weeks)

^ 10 ohms (measured) 10 ohms (regression) o 100 k-ohms (measured) -•- 100 k-ohms (regression)

Fig. 6. Control chart with measured and predicted

corrections for the MCS calibrator for DCR.

Table 6

MCS Type B Standard Uncertainties for DCR

Resistance Range Calibrated Points Full Range

1 Q 20 [iQ/Q 60 \iQ/Q

lOQ 10 iLiQ/Q 30 |LiQ/Q

100 Q 6 [xQ/Q 18 [iQ/Q

1 kQ 3 [iQ/Q 9 ^Q/Q

10 kQ 3 |iQ/Q 9 [xQ/Q

100 kQ 4^Q/Q 12 |iQ/Q

1 MQ 5 [iQ/Q 15 ^iQ/Q

10 MQ 20 [iQ/Q 60 nQ/Q

100 MQ 30 [iQ/Q 90 [iQ/Q

11
3.4 AC Voltage (ACV)

The low-frequency ACV function of the MCS calibrator and DMMs is periodically calibrated using

a multirange thermal voltage converter (TVC) that has been calibrated against a set ofNIST reference

TVCs, micropotentiometers, and a calculable DSS [8] . The ac-dc differences of these support

instruments are ultimately referenced to a set of characterized TVCs that are the NIST standards for

ac-dc difference [9]. The test procedures for characterizing the system calibrator and DMMs for ACV

are more complex than the other functions and will be described in detail.

3.4.1 Voltages from 1 mV to 1 kV from 10 Hz to 1 MHz

The multirange TVC is connected to the MCS calibrator and to the DMM (both set to the ACV mode)

as shown in Fig. 7. The nominal ac voltage Fat frequency// is programmed and the output emf of

the TVC, e„ is measured using the dc digital voltmeter (DVM). The calibrator function is switched

to +DCV and the amplitude is programmed to +V. The calibrator voltage is adjusted to V+^j to bring

the TVC emf e^^j to within ±t of . [The operator selectable tolerance t is typically between 1

0

)iV/V and 50 |iV/V.] The calibrator is switched back to ACV and the TVC emf and the DMM

ACV reading R^, are recorded. The calibrator is then switched to -DCV and adjusted to V_^/ to bring

the TVC emf e_^j to within ±t of e^^ . The above procedure is repeated for frequencies throughfThe TVC is disconnected, the calibrator is switched to ACV, frequencies fj through/ are set at the

same nominal voltage V, and the DMM readings through i?^- are recorded.

Fig. 7. Setup for characterizing the ACV fiinction of the

MCS using a multirange TVC.

12
The calibrator correction for each test voltage at frequencyf- is described by:

CcAcvi = (V,i - V) / Ku + (e.^ - ej/(nej + D. + C.^^y, (7)

where V^- = (7^^^ - V_^i)/2 {ave. dc voltage}

^di = (^^di + ^-diM^ {ave. TVC emf with ±DCV applied} n = the TVC power coefficient at the nominal voltage

Di = the ac-dc difference of the TVC at the nominal voltage at

/

QocF ^ the average calibrator DCV correction.

The DMM correction for each test voltage at frequency/ is given by:

where = the DMM reading of the test voltage at f^.

Notes: i. The above procedure is designed to allow the MCS to be calibrated using the

reference TVCs as well as the multirange TVC. By driving the dc voltage to match the TVC output when ac voltage is applied, the importance of an

accurate knowledge of the TVC power coefficient n is minimized by

minimizing the numerator in the second term of(7). For the reference TVCs,

this coefficient varies between 1.6 and 2 as afunction ofthe test voltage and

must be measured at each voltage. The multirange TVC has a nominalpower

coefficient of 1, which is relatively insensitive to the test voltage, so the

tolerance t may be increased to reduce test time.

a. The reference TVC time constants are typically 1 s to 2 s; therefore, a wait

period ofup to 30 s is required before recording the TVC emf. To minimize

the effects ofdrift, it is important that all ofthe wait periods are the samefor

a particular set ofmeasurements. The multirange TVC settles in about 10 s and has a low drift rate so timing is not as critical.

Hi. It is important that the dead time in switching from the ACV to the DCV

functions is minimized. For the highest accuracy using reference TVCs, a

switch and auxiliary supply are used to keep the TVC energized while the

calibrator is switching between functions. The multirange TVC is less

sensitive to switching time.

iv. The dc DVMshould be able to resolve the TVC emfto within ±1 ju V/V. This

resolution corresponds to several nVfor the reference TVCs (which have

output emfs from 2 mV to 10 mV) and several /iVfor the multirange TVC

(which has a full scale output ofabout 2 V).

V. Depending on the random error ofthe measurements, an actual calibration

consists offrom 1-10 repeats ofthe described procedure.

As the test frequency increases the calibrator becomes more sensitive to the load imposed by the TVC

and the test DMM. Therefore, to obtain the lowest uncertainties, the calibrator must be characterized

for each DMM type using the procedure described above. The second set of DMM readings i?^, is

13
used to generate unique corrections C^^cvhx) for all DMMs of that type (type-X DMMs for this

example). These corrections apply only when a type-X DMM is connected to the calibrator using the

same connectors and cables that were used to obtain the set of R^j readings. The unique set of

calibrator corrections for each DMM type are given by:

^cACVi(X) ~ ^cACVi ^di(X)- (9)

where Q,^^^ = (R^kx) - Rai(x)^^i represents the additional correction needed to compensate for the

difference between the calibrator output vohage (programmed to with the TVC and type-X DMM

connected and with only the type-X DMM connected.

3.4.2 Voltages from 1 mV to 250 mV from 10 Hz to 1 MHz

A reference micropotentiometer (i^pot) is connected to the system calibrator output and a DMM is connected to its output as shown in Fig. 8. The calibrator is set to the ACV function at 1 kHz and its voltage is adjusted until the DMM reading R^g is within ±t of the test voltage V. The DMM reading

R^Q and the |apot output emf e^g are recorded. The calibrator frequency is programmed to // (the first test frequency), the calibrator voltage is adjusted until the |j.pot emf e^, is within ±t of e^g, and the

DMM reading R^, is recorded. The calibrator is programmed to 1 kHz, the calibrator voltage is adjusted until the nominal test voltage V±t is read by the DMM, and its reading R^, and the )ipot emf

e^, are recorded. The procedure is repeated for frequencies /, through f- interleaving a 1 kHz

measurement between measurements at each test frequency.

V/////////C3PIB ////////////

DMM

mPOT

MULTIFUNCTION CALIBRATOR

DVM

CONTROLLER

Fig. 8. Setup for characterizing the ACV function of

the MCS using a |Lipot.

The jipot is removed, the DMM is connected directly to the calibrator output, frequencies// through

are set at the test voltage V, and the DMM readings i?^/ through i?^, are recorded.

14
The DMM corrections for each test voltage at frequency/ is described by the following relationship:

Q = (Rr, - RJ/Rr, + (e„, - e,,)/(nej + D, + (10)

where Rj^i ^ (Rro-i) + Rn)/^ {ave. 1-kHz reading}

^Ri ^ (^r(i-i) + ^ri)/^ {^yQ. i^pot emf with 1 kHz applied} n = the )ipot power coefficient at output voltage V

D- ^ the ac 1-kHz difference of the jipot at output V -dXf- C^n = the DMM 1-kHz correction.

The calibrator correction is given by:

c.iA = (R,i(i + cj-v)/v (11)

where R^^ = the DMM reading of the test voltage at

3.4.3 Voltage from 250 mV to 7 V from 10 Hz to 30 MHz

Measurements are performed using the calibrator 50-Q wideband output port. Special 50 Q TVCs,

calibrated out to 30 MHz, are used to measure the amplitude flatness of the calibrator using a technique similar to that described in 3 .4. 1 , except the calibrator is left on the ACV function and each

test frequency is referred back to 1 kHz.

A 50 Q TVC is connected to the wideband output of the MCS calibrator and to a wideband DMM

in a similar manner as shown in Fig. 7. The nominal voltage Fat frequency// is programmed and the

TVC emf is measured using the dc DVM. The calibrator firequency is set to 1 kHz and its amplitude is adjusted to V^g to bring the TVC emf to within ±t ofe^. The calibrator frequency is set to fj and the TVC emf e^, and the DMM reading R^, are recorded. The calibrator is reprogrammed to 1 kHz and adjusted to V^, to bring the TVC emf e^, to within ±t ofe^,. The above

procedure is repeated for fi"equenciesf throughf .

The TVC is disconnected, frequencies f throughf are set at the same nominal voltage V, and the

DMM readings i?^/ through i?^, are recorded.

The calibrator correction for each test voltage at fi-equencyf is described by:

Cacvi = (VRi - + (e^, - ej/(nej + D, + Q„ (12)

where V,^- = (V^^,,,^- V_^-)/2 {ave. 1-kHz voltage}

^di = (e^di + e,^i)/2 {ave. 1-kHz TVC emf}

n = the TVC power coefficient at V

Z). = the ac-dc difference of the TVC aXVatf

C^n = the calibrator 1 kHz correction at V.

15
The DMM correction for each test voltage at frequency/ is then given by:

C,,cvi = (V(l + C,,cvi)-RJ/K. (13)

where = the DMM reading of the test voltage at f-.

3.4.4 Voltages from 1 mV to 1 kV from 0.01 Hz to 1 kHz

A programmable digitally synthesized source (DSS) developed at NIST is employed in place of the

system calibrator to perform high accuracy, low-frequency tests of DMMs. The DSS synthesizes a

staircase approximation of a sine wave using a sine look-up table and a precision digital-to-analog

converter (DAC). Output voltages are programmable between 1 mV and 7 V (for higher voltages an

external dc-coupled amplifier is used). A DMM (on its DCV frmction) is used to measure the dc

voltage of each ofthe steps in the approximation. The rms value ofthe output voltage is computed

by this step calibration:

V, = (Tv,'/N)''\ (14)

where v,. = the dc voltages of the steps

A'^ = the number of step per period.

The frequency response rms error of the synthesized signal is measured between 20 Hz and 1 kHz

using a calibrated multirange TVC. Below 20 Hz, it is assumed that the rms value remains constant

to within ±2 |iV/V. At 7 V, the frequency response out to 1 kHz is flat to within ± 5 |nV/V. This

performance degrades at lower voltages; however, even at 1 mV, the DSS may be treated as an ac

calibrator with zero correction below 20 Hz. DMMs calibrated using the DSS are assigned

corrections Q^ck/ by:

C,,cvi-(K(l + C,ss^-RJ/R,, (15)

where R^^ = the DMM reading at frequencyfCjjssi = the DSS correction to at frequency .

Control charts for the ACV function corrections of the system calibrator and DMMs are quite

complex covering voltage, frequency, and DMM type. A sample chart for the ACV calibrator

corrections at 10 V at 10 kHz is shown in Fig. 9. ACV corrections are less predictable than the DCV

corrections; however, until the drift patterns are better understood, a least squares linear fit to the

correction time series is performed and a linear equation is used to predict the calibrator correction

between calibrations. The system software also linearly interpolates between calibration points to compute corrections over the full range. Specific software corrections for the DMMtype being tested are applied where possible and all interconnection parameters are specified. In a similar manner,

when a calibrator is tested using a system DMM, the DMM type and all interconnection parameters

are specified. Measurements are performed at a specific set of voltages and frequencies from 1 mV

to 1 kV and 0.1 Hz to 30 MHz. Measurements can be made at other than the calibrated points;

16
however, because the corrections at these points are interpolated estimates, the MCS uncertainties are somewhat larger. The Type B standard uncertainties ofthe MCS ACV function are given in Table 7.

60 r 55

?50

25

20 J

0 10 20 30 40 50 60 70 80 90 100

Time (weeks)

o 10 V @ 10 kHz (measured) 10 V @ 10 kHz (regression)

Fig. 9. Control chart with measured and predicted

corrections for the MCS calibrator at 10 V and 10 kHz.

Table 7

MCS Type B Standard Uncertainties for ACV

Voltage Range Calibrated Points Full Range

1 mV to 10 mV (10/v)(70 + f)|iVA^ (10/v)(200 + f)|aV/V

lOmVto 100 mV (70 + f72)^VA^ (200 +f72 )^VA^

100 mV to 500 mV (20 + f /5)^VA^ (60 + f/5)[iY/V

500 mV to 100 V (10 + f710)^V/V (30 + f/10)|iVA^

100 V to 1 kV (20 + f/5)[iV/V (60 + f75)^VA^

Where v = test voltage in mV and f = test frequency in kilohertz.

3.5 AC Current (ACI)

The ACI function of the MCS calibrator and DMMs is periodically calibrated against a set of

reference thermal current converters (TCCs), ac shunts, and a calculable DSS. The ac-dc differences

of these support instruments are ultimately referenced to a set of characterized TCCs that are the

NIST standards for ac-dc difference [10]. The test procedures for characterizing the system calibrator

and DMMs for ACI are also described in detail.

17
3.5.1 Currents from 2 mA to 10 A from 10 Hz to 100 kHz

The reference TCC is connected to the system cahbrator and DMM (both set to the ACI function) as shown in Fig. 1 0. The cahbrator is programmed for the nominal current / at frequency// and the TCC

output emf e„ is measured by the dc DVM. The calibrator function is switched to +DCI and

programmed to +/. The calibrator current is adjusted to I^^, to bring the TCC emf e^^, to within

±t |iV/V of e„. The calibrator is switched back to ACI, the TCC emf e^, and the DMM ACI reading

R^, are recorded. The calibrator is then switched to -DCI and the negative polarity dc current is adjusted

to to bring the TCC emf to within ±t p.V/V of e^, . The above procedure is repeated for

frequencies throughf^.

GPIB

DMM B

MULTIFUNCTION

CALIBRATOR

SHUNT

TCC DVM

/

CONTROLLER

Fig. 10. Setup for characterizing ACI function of MCS

calibrator using a TCC.

The TCC is removed, the calibrator is switched to ACI, frequencies /; through/ are set at the same

nominal current / , and the DMM readings R^, through i?^, are recorded. The calibrator correction at each test current at frequency / is described by:

C.c/,- = r4 - /;// + (e^, - ej/(ne,) + A + C^oc. (16)

where 7^- = (7+^,. - {ave. dc current}

e^- = (e+^i + e_^i )/2 {ave. TCC emf with ±DCI applied} n = the TCC power coefficient at the nominal voltage

Z), = the ac-dc difference of the TCC at the nominal voltage at

/

^cDci ^ the average calibrator DCI correction.

18
The DMM correction at each frequency Q^c// is given by:

dACIi (i(i + c,,„i)-RJ/i- (17)

As the frequency increases the cahbrator becomes more sensitive to the load imposed by the TCC and

the test DMM. Therefore, for the highest accuracy test of a particular DMM type, the above

procedure must be performed using that DMM type. The second set of DMM readings 7?^, is used to generate unique corrections C^^cii(X) for all DMMs of that type (type-X DMMs for this example).

These corrections apply only when a type-X DMM is connected to the calibrator using the same

connectors and cables that were used to obtain the set ofi?^,- readings. These corrections are given by:

C^cACIi(X) = C^cACIi + C^di(X)' (18)

where Q,y;j.^ = (Ri,i(X) - Rai(X))^^ represents the additional correction needed to compensate for the

difference between the calibrator output current (programmed to /,) with the TCC and type-X DMM

connected, and with only the type-X DMM connected.

As with DCI, ACI measurements are made at various compliance voltages and a correction factor for

the calibrator compliance voltage is applied when testing a DMM type that has not been characterized

with the system calibrator.

Control charts for the ACI function corrections of the system calibrator and DMMs are also quite

complex covering current, fi^equency, and DMM type (or compliance voltage). A sample chart for

the ACI calibrator corrections at 1 A, at 1 kHz for one of the DMM types is shown in Fig. 1 1 . ACI

corrections are less predictable than the DCI corrections; however, until the drift patterns are better

40

35

10 15 20 25 30

Time (weeks)

o 1 A @ 1 kHz (measured) -•- 1 A @ 1 kHz (regression)

Fig. 1 1 . Control chart with measured and predicted

corrections for the MCS calibrator for ACL

19
understood, a least squares linear fit to the correction time series is performed and a linear equation

is used to predict the calibrator correction between calibrations. The system software also linearly

interpolates between calibration points to compute corrections over the fiall range. Specific software

corrections for the DMM type being tested are applied where possible and all interconnection

parameters are specified. In a similar manner, when a calibrator is tested using a system DMM, the

DMM type and all interconnection parameters are specified.

3.5.2 Currents from 2 mA to 10 A from 0.01 Hz to 1 kHz

The NIST DSS and Transconductance Amplifier are employed to perform high accuracy, low

fi-equency current tests of DMMs. A DMM (on its DCI function) is used to measure the dc current

of each of the steps in the waveform approximation. The rms value of the output current is computed by this step calibration:

i

= (i:if/Ny^\ (19)

- where /• = the dc currents of the steps = the number of steps per period.

The frequency response error of the synthesized signal is measured between 20 Hz and 1 kHz using

a calibrated TCC. Below 20 Hz, it is assumed that the rms value remains constant to within ±2 |liA/A.

At currents between 100 mA and 10 A, the fi"equency response out to 1 kHz is flat to within

±100 |iA/A. This performance degrades at lower currents; however, even at 1 mA, the DSS may be

treated as an ac calibrator with zero correction below 20 Hz. DMMs calibrated using the DSS are assigned corrections Q/jc// ^y:

C,ncn = asa + C,ssJ-RJ/R,. (20)

where i?^, = the DMM reading at frequencyf- ^Dssi ^ the DSS correction to at frequencyf- .

Again, a least squares linear fit to the correction time series is performed and a linear equation is used

to predict the calibrator correction between calibrations. The system software also linearly

interpolates betiveen calibration points to compute corrections over the full range. Specific software

corrections for the DMM type being tested are applied where possible and all interconnection

parameters are specified. In a similar manner, when a calibrator is tested using a system DMM, the

DMM type and all interconnection parameters are specified.

Measurements are performed at a specific set of currents and frequencies from 1 mA to 1 A and

0.1 Hz to 1 kHz. Measurements can be made at other than the calibrated points; however, because

the corrections at these points are interpolated estimates, the MCS uncertainties are somewhat larger.

The Type B standard uncertainties of the MCS ACV function are given in Table 8.

20
Table 8

MCS Type B Standard Uncertainties for ACI

Current Range Calibrated Points Full Range

1 mA to 10 A (50 + 2fmA/A (150 + 3f)>iA/A

Where f = test frequency in kilohertz.

4. CALIBRATIONS AND TESTS USING THE MCS

Once the system calibrator and DMMs have been characterized, the MCS is used to test customer's

DMMs, calibrators, and related instruments.

Prior to testing, the test instrument is energized in the MCS lab overnight, to allow it to stabilize and

to satisfy any warmup requirements. Then, self-calibration or auto-zeroing routines are performed

to bring the instrument to its rated uncertainty.

4.1 Calibration of DMMs Using the MCS Calibrator

Unless otherwise requested, the DMM is calibrated at its input terminals. Using an adjustable

platform, the DMM terminals are brought "nose-to-nose" with the MCS calibrator terminals so that

only a few centimeters of connectors are required to interconnect them as shown in Fig. 12. The

calibrators have six output terminals including outputs (hi and lo), sense (hi and lo), guard and

ground. Test DMMs have a similar set ofinput terminals. Tables 9-11 list the interconnections made

for tj/pical DMM calibrations.

Table 9

Connections and configuration for a DCV or ACV calibration

From To

Calibrator voltage output hi DMM input hi

Calibrator voltage output lo DMM input lo Calibrator guard and ground

The calibrator is programmed to local sense and local guard, and the DMM is programmed or switched to local guard.

21
Table 10

Connections and configuration for a DCI or ACI calibration

From To

Calibrator current output hi DMM current input hi

Calibrator current output lo DMM current input lo

Calibrator guard and ground

The calibrator is programmed to local guard, and the DMM is programmed or switched to local

guard.

Table 11

Connections for a DCR (4-wire) calibration

From To

Calibrator resistance output hi DMM resistance input hi

Calibrator resistance output lo DMM resistance input lo

Calibrator resistance sense hi DMM resistance sense hi

Calibrator resistance sense hi DMM resistance sense hi

Calibrator guard DMM guard

Calibrator ground

The calibrator is programmed to remote sense and local guard, and the DMM is programmed or switched to local guard.

Calibrations are performed by programming the MCS calibrator to the desired function and setting,

triggering the DMM (the first reading is ignored), and recording the next N readings.

The average reading ofthe DMM under test R, its associated correction Cj^^^, the system calibrator

setting S, and its correction C^cal ^^e related by the following equation:

R(1+C,^mm)=S(1 + Cscal)- (21)

22
Certain DMMs have software correction tables that are used to keep the instrument witliin a particular

specification. Correction tables are updated by applying a reference signal from the MCS calibrator

and then initiating a GPIB "correction" command that changes the appropriate correction value until

the DMM displays the proper value to within a selectable tolerance. Both the MCS software and the

Wavetek 4950 software have this capability. Repeat tests are performed to verify that the DMM

correction table has been accurately modified. This service represents a change in the long-standing

NIST policy of not adjusting instruments submitted for test. However, instead of making an analog

adjustment which can not generally be undone, in this case the adjustment is digital. The initial corrections are stored in the instrument and the residual corrections are given in the test report. The

uncertainties ofthe residual corrections are based on the standard uncertainty ofthe calibrator and the

standard deviation of the repeat tests.

4.2 Calibration of Calibrators using the MCS DMM

Unless otherwise requested, calibrators are tested at their output terminals using the setup shown in

Fig. 12. The interconnections are the same as those given in Tables 9-11. The test calibrator setting

S is related to the system DMM reading R:

S(l+Cj^^i) -R(l + CsdmJ, (22)

NOSE TO NOSE FAST DMM OR FAST CALIBRATOR TEST SETUP

TO COMPUTER ^

CALIBRATOR TO COMPUTER

ADJUSTABLE PLATFORM

Fig. 12. Setup to calibrate a test DMM using the

characterized MCS calibrator.

where Cj-^^^ is the test calibrator correction and C^^mm is the system DMM correction.

As with DMMs, certain calibrators have software correction tables that are used to keep the

instrument within a particular specification. Correction tables are updated by applying a nominal

signal fi-om the test calibrator to the MCS DMM, and then initiating a GPIB "correction" command,

23
which changes the appropriate correction value until the DMM displays the proper value to within a selectable tolerance.

4.3 High Accuracy Special Test of DMMs and Calibrators

The highest accuracy test of a DMM or calibrator involves direct comparisons against the standards

that are used to characterize the MCS DMMs and calibrator using the techniques described in 3.4. These are inherently more time consuming and expensive than the automated tests described in 4.2.

4.4 Special Test of Low Voltage Thermal Voltage Converters

Low voltage thermal voltage converters are tested using the MCS multirange thermal voltage

converter. Tests are performed by placing the two instruments nose-to-nose, and then applying ac and dc voltages, while monitoring the output of each device. The ac-dc difference corrections for the

TVC under test are calculated by using the techniques described in 3.4.

4.5 Special Test of Micropotentiometers

Micropotentiometers are tested using the MCS multirange thermal voltage converter. Tests are performed by connecting the )ipot input to the calibrator output and the |apot output to the thermal

converter input and then applying ac and dc voltages, while monitoring the output of each device.

The ac-dc difference corrections for the i^pot under test are calculated using the techniques described

in 3.4.

5. QUALITY CONTROL AND UNCERTAINTIES

The MCS relies on standards that are calibrated in other laboratories in the NIST Electricity Division

and it is important to maintain traceability back to these standards. Each of the support artifacts or instrument standards is calibrated on a regular interval (normally once a year) and a control chart

describing its value and uncertainty at any time is maintained. The MCS calibrator and DMMs are normally characterized four times a year using the support standards. The calibrator and DMMs are also intercompared several times per month to track long-term stability. The standard deviation of

this intercomparison represents a composite stability figure for the calibrator and two DMM types.

The standard uncertainty ofeach function in the MCS calibrators and DMMs is based on the standard

uncertainties of the associated support instrument, the repeatability of the transfer process, and the

long-term stability of the calibrator. The figures given in the tables in section 3 represent onestandard deviation (1-sigma) estimates of the system standard uncertainty. Note: These are compositefigures that servefor both the calibrator and the DMMs. Over a large parameter space

thefigures apply equally to both; however, at highfrequencies, the stability ofthe calibrator may be

significantly better than the DMMs. Under these conditions, a different set ofuncertaintyfigures is used. The total uncertainty of a test performed using the MCS includes the short-term stability of the

instrument under test. For example, the uncertainty of a test DMM calibrated by the MCS calibrator

on the ACV function depends on the uncertainties of the following parameters:

24
1. The ac-dc difference of the muhirange TVC, fZ/y^ (see 3.4)

2. The correction of the dc voltage function of the cahbrator, U^f-. (see 3.1).

3. The standard deviation of the process in which the calibrator ac voltage is compared to its dc

voltage, (see 3.4).

4. The long-term stability of the calibrator/DMM at the test point, Ui^j^ (the standard deviation

of periodic comparisons with a system DMM).

5. The short-term stability ofthe test, U^ts (the standard deviation ofthe measurement including

the MCS calibrator and the instrument under test).

These values (all 1 -sigma estimates) are combined according to the procedures recommended in [6] to give the expanded total uncertainty, Uj

U, = 2(Uso + U,ri + Usri + U^c' + UrycT (23)

where the first three terms are considered to be type A standard uncertainties and the last two are type

B standard uncertainties.

7. ACKNOWLEDGMENTS

The authors wish to acknowledge those people who helped in the development of the MCS: Barry

Bell, the group leader ofthe Electronic Instrumentation and Metrology Group, for his strong support;

Ron Dzuiba, and Dean Jarrett for sharing their expertise in resistance measurements; Dick Steiner and

June Sims for assisting in dc voltage support; Joe Kinard and Tom Lipe for providing ac-dc transfer

calibrations and overall guidance in ac-dc voltage measurement techniques; Robert Palm for

prototyping and drafting support; and Kathy Magruder for running tests, and performing much ofthe

data reduction necessary for the MCS.

25
8. REFERENCES

N. M. Oldham, M. E. Parker, A. M. Young, and A. G. Smith, "A High-Accuracy 10 Hz -

1 MHz Automatic AC Voltage Calibration System," IEEE Trans. Instrum. Meas., IM-36,

pp.883-887, Dec. 1987.

N. M. Oldham, "New Low-Voltage Standards in the DC to 1-MHz Frequency Range," IEEE

Trans. Instrum. Meas., Vol. 40, No. 2, pp. 368-372, Apr. 1991.

N. M. Oldham, P. S. Hetrick, "A Calculable, Transportable Audio-Frequency AC Reference

Standard," IEEE Trans. Instrum. Meas., Vol. 38, No. 2, Apr. 1989.

N. M. Oldham, "A 50-ppm AC Reference Standard which Spans 1 Hz to 50 kHz," IEEE

Trans. Instrum. Meas., IM-32, No. 1, Mar. 1983.

C.A. Hamilton et al., "The NBS Josephson Array Voltage Standard," IEEE Trans. Instrum.

Meas., IM-36, No. 2, pp 258-261, June 1987.

B. N. Taylor, C. E. Kuyatt, "Guidelines for Evaluating and Expressing the Uncertainty of

NIST Measurement Results," NIST Technical Note 1297, 1994 Ed.

R.F. Dziuba et al, "NIST Measurement Service for DC Standard Resistors," NIST Technical

Note 1298, 1992.

N.M. Oldham, P.S. Hetrick, and X. Zeng, "A Calculable, Transportable Audio-Frequency AC

Reference Standard," IEEE Trans. Instrum. Meas., Vol. 38, No. 2, pp. 368-371, April 1989.

J.R. Kinard et al, "NIST Measurement Services: AC-DC Difference Calibrations," NIST

Special Publication 250-27, May 1989.

26
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