# Patent

## Title
D-optimized switching converter

## Abstract

A switching converter produces an output signal transmitted to a variable load impedance to produce a load voltage VDD across the load impedance and holds VDD close to a set point voltage VSP selected by control data DREF1 to compensate for variations in the load impedance which tend to drive VDD away from VSP. The switching converter includes a pulse-width modulated power converter for producing the output signal of voltage VOUT in response to an input signal of voltage VIN, wherein a ratio VOUT/VIN is a function of a duty cycle D1 of a pulse-width modulated signal VPWM1. A pulse-width modulation circuit generates the VPWM signal of duty cycle D1 controlled by a control signal, and a feedback control circuit monitoring the load voltage VDD adjusts D1 to keep the load voltage as close as possible to VSP. A power source supplies the input signal of voltage VIN to the power converter. Second control data supplied to the power source separately selects the value of VIN for each possible set point voltage VSP such that that the pulse-width modulate signal's duty cycle D1 remains as close a possible to a value for which circuit performance is substantially optimal with respect to a selected combination of performance criteria.

## Background
BACKGROUND OF THE INVENTION
1. Field of the Invention
The invention relates in general to switching converters used by integrated circuit (IC) testers for supplying power to IC devices under test, and in particular to a feedback compensated switching converter that minimizes variation in its output voltage under varying load conditions.
2. Description of Related Art
An IC tester supplies test signals to input terminals of an IC device under test (DUT) and monitors the DUT's output signals to determine whether they behave as expected. FIG. 1 depicts a typical prior art IC tester 10 including a host computer 12 communicating with a test head 14 via a computer bus 16. Before starting a test, host computer 12 sends program instructions to test head 14 via bus 16 defining the test signal patterns to be applied to DUT 18 during the test and indicating how the DUT output signals are expected to behave. During the test, test head 14 transmits test signals to input terminals of DUT 18, monitors DUT output signals and stores test data indicating whether the DUT output signals behave as expected. After the test, test head 14 forwards the test data to host computer 12 via bus 16.
A typical test head 14 includes a number (N>1) of printed circuit channel cards CH1 through CHN, each implementing one or more tester channels 20. Each tester channel 20 is connected to a separate pin of DUT for supplying a test signal input to the pin or for monitoring a DUT output signal appearing at the pin. A bus interface circuit 22 forwards instructions arriving from host computer 12 via bus 16 to channels 20 and forwards test results data from channels 20 to host computer 12 via bus 16.
A power bus 24 distributes a DC power supply signal VBUS produced by an off-line, AC-to-DC converter 26 to each channel card CH1 through CHN for powering components on the channel cards. The DC supply voltage VBUS will be relatively high, for example 48 volts DC, to limit the amount of current power bus 24 conveys, but each channel card CH1 through CHN includes an “intermediate bus converter” 28 for converting the 48VDC VBUS signal to a lower intermediate bus voltage VIB, such as for example 12 VDC. Since tester channels 20 require several (M>1) different supply voltages V1-VM for use as reference voltages and for powering the channels, a set of “point-of-use” converters 301 through 30M are provided on each channel card for converting the intermediate bus voltage VIB into the required supply voltages V1 through VM. Before the test, host computer 12 sends instructions via bus 16 and bus interface circuit 22 to each point-of-use converter 30 for setting each converter's output voltage.
Test head 14 also includes a power supply card 32 for converting the 48VDC VBUS signal into an output signal VOUT connected via signal path to the DUT's power input terminal, thereby producing a load voltage VDD between the DUT's power input terminal and ground. Power supply card 32 includes an intermediate bus converter 34 for converting the fixed bus voltage VBUS into a lower fixed intermediate bus voltage VIN, such as 12 VDC, and a compensated point-of-use switching converter 36 for converting the 12VDC VIN voltage into the output signal VOUT. A bus interface circuit 38 responds to an instruction from host computer 12 via bus 24 by supplying control data DREF to converter 36 indicating a desired set point voltage level VSP for the DUT load voltage VDD.
FIG. 2 models the load and feedback impedance of point-of-use converter 36 of FIG. 1 and shows that a signal path 44 having impedance 40 couples the output signal VOUT of converter 36 to DUT 18 to produce a load voltage VDD across load 41 of the DUT. Path impedance 40, which includes inductance, capacitance and resistance, filters VOUT so that the load voltage VDD appearing across DUT load 41 differs from VOUT, particularly when DUT load 41 draws a large current. The load voltage VDD can vary during a test because the amount of current DUT load 41 varies. Since test specifications typically require variations of the load voltage VDD from some specified set-point value VSP to be held within a specified range, converter 36 must compensate for variations in VDD. The load voltage VDD is therefore fed back to converter 36 via a separate feedback path 44 (FIG. 1) to enable converter 36 to monitor the load voltage and appropriately adjust its output voltage VDD to keep VDD as near as possible to VSP. Although the impedance 42 of feedback path 44 (FIG. 1) filters VDD so that the voltage of the feedback signal VFB converter 36 receives varies somewhat from VDD, the current of the feedback signal VFB is relatively small compared to the current of the VOUT signal so that the voltage of feedback signal VFB tracks the voltage of VDD much more closely than the voltage of VDD tracks that of VOUT. Thus converter 36 can monitor the DUT input signal voltage VDD by monitoring feedback signal VFB and can adjust VOUT as necessary to keep the voltage of VFB, and therefore the voltage of VDD, near its desired set point voltage VSP.
FIG. 3 depicts a typical prior art architecture for the compensating point-of-use converter 36 of FIGS. 1 and 2, including a digital-to-analog converter (DAC) 50, a feedback control circuit 52, a pulse-width modulator (PWM) 54, and a power converter 56 for converting the input signal VIN from intermediate bus converter 34 (FIG. 1) to the VOUT signal supplied to DUT 16. DAC 50 converts the DREF data from host computer 12 (FIG. 1) into a reference signal VREF of voltage matching the desired set point voltage VSP of VDD. Feedback control circuit 52 compares a filtered version of feedback signal VFB to VREF and produces a control signal VC for controlling PWM circuit 54 which produces a pulse-width-modulated output signal VPWM having a duty cycle D controlled by control signal VC. Power converter 56 responds to VPWM by producing the VOUT signal in response to the VIN signal from intermediate bus converter 34 of FIG. 1. The duty cycle D of VPWM controls the ratio VOUT/VIN.
FIG. 4 depicts an example implementation of power converter 56 of FIG. 3. When VPWM is high, transistor Q1 turns on to connect the VIN signal across a diode D1 and across a capacitor C1 via an inductor L1. Capacitor C1 charges, driving UP VOUT, which appears across capacitor C1. D1 is typically a FET biased ON, commonly referred to as a synchronous rectifier. When VPWM is low, VIN no longer charges C1 and VOUT falls. The average magnitude of VOUT is therefore a function of the duty cycle D of VPWM. This particular power converter, which produces an output voltage VOUT that is less than its input voltage, is called a “buck converter”.
FIG. 5 is a timing diagram depicting VPWM as a function of time. The VPWM signal is a square wave of period TP that is on for a time TON during each cycle. The ratio VOUT/VIN is equal to the duty cycle D=TON/TP of the VPWM signal, set by the voltage of control signal VC of FIG. 3. In the example buck converter circuit of FIG. 4

VOUT/VIN=D. 

For other types of converter circuits known to those of skill in the art, the ratio VOUT/VIN can be a more complex function of D. For all power converters relying on pulse-width modulation, we can generally express VOUT/VIN as some function of duty cycle D:

VOUT/VIN=f(D)

For the buck converter of FIG. 4,

f(D)=D 

For a typical “boost” converter producing an output voltage VOUT that is higher than its input voltage VIN,

f(D)=1(1−D)

For a typical “buck boost” converter producing an output voltage that can be either higher or lower than VIN 

f(D)=−D/(1−D)

Other converters known to those of skill in the art, including for example sepic, flyback, forward, two-switch forward, active clamp forward, half bridge, push pull, full bridge, and phase shift converters, have output-to-input voltage ratios characterized by other functions of the duty cycle D of VPWM.

Referring again to FIG. 3, a typical feedback control circuit 52 will include an amplifier 36 and a pair of filters 38 and 40. The VREF signal output of DAC 50 drives a non-inverting input of amplifier 36. Filter 38 couples the VC signal to an inverting input of amplifier 32 while filter 40 couples VFB to the inverting input to amplifier 36. When designing feedback control circuit 52, those of skill in the art design filters 38 and 40 to optimize a selected combination of one or more converter performance criteria such as for example, audiosusceptibility, transient response, closed loop frequency response, noise immunity, and power dissipation. Such performance criteria depend to some extent on the duty cycle D of VPWM. A circuit designer will typically choose some nominal value of D, such as for example 0.5, and then design filters 38 and 40 to optimize a desired combination of performance criteria under the assumption that converter circuit 36 will operate at that particular duty cycle. During system operation the value of D will vary when the DUT load varies in order to keep VDD near the selected set point voltage VSP, but D will normally not vary over a wide range unless the load varies wildly. If the system is optimized for a value of D of 0.5, and the selected set point voltage VSP causes the value of D to remain close to 0.5, then the converter will exhibit close to optimum performance. However when the selected set point voltage VSP caused the value of D to reside in a range remote from 0.5, the converter will exhibit suboptimal performance. Generally the desired combination of performance criteria will be substantially optimal only for a narrow range of set point voltages and will be substantially less than optimal when the converter is set for any set point voltage outside that narrow range.
One way to resolve this problem is to provide filters 38 and 40 with adjustable transfer functions, and to appropriately adjust their transfer functions to optimize performance criteria for each selected value of VSP. However this approach increases the complexity of the filter design task, increases the cost and complexity of filters 38 and 40, and requires additional circuits for selecting and controlling the filter transfer functions.
What is needed is a converter for which a desired combination of performance criteria is optimized over its entire range of set point voltages without requiring filters having adjustable transfer functions.
SUMMARY OF THE INVENTION
A switching converter in accordance with the invention produces an output signal of voltage VOUT supplied through a signal path to a variable load impedance to produce a load voltage VDD across the load impedance. The switching converter adjusts output signal voltage VOUT to keep load voltage VDD as near as possible to a desired set point voltage VSP selected by input first control data DREF1.
The switching converter includes a first power converter powered by an input signal of voltage VIN for producing the output signal VOUT. The ratio VOUT/VIN is a function of a duty cycle D1 of a pulse-width modulated signal supplied as input to the first power converter. A pulse-width modulation circuit generates the pulse-width modulated signal with its duty cycle D1. A feedback control circuit monitors the load voltage and adjusts the duty cycle of the pulse-width modulated signal to keep the load voltage near the set point voltage VSP selected by the first control data. A power source supplies the input signal of voltage VIN to the first power converter, with VIN selected by second control data (DREF2) supplied as input to the power source.
A transfer function of the feedback circuit is designed to optimize a selected combination of converter performance criteria when the duty cycle D1 of the pulse-width modulated circuit is a particular value Dx. Thus in order to produce a load voltage VDD=VSP, the first control data is set to select VSP as the set point voltage and the second control data is set to select an appropriate value of VIN so that pulse-width modulated signal's duty cycle D1 remains as close as possible to the value Dx for which circuit performance is substantially optimal with respect to the selected combination of performance criteria.
The claims appended to this specification particularly point out and distinctly claim the subject matter of the invention. However those skilled in the art will best understand both the organization and method of operation of what the applicant(s) consider to be the best mode(s) of practicing the invention by reading the remaining portions of the specification in view of the accompanying drawing(s) wherein like reference characters refer to like elements.



BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 depicts a prior art integrated circuit tester in block diagram form.
FIG. 2 depicts the point of use converter of FIG. 1, along with its load impedances in block diagram form.
FIG. 3 depicts the prior art point of use converter of FIG. 1 in more detailed block diagram form.
FIG. 4 depicts the prior power converter of FIG. 2 in schematic diagram form.
FIG. 5 is a timing diagram depicting behavior of a pulse-width modulated signal of FIG. 3.
FIG. 6 depicts in block diagram form an integrated circuit tester employing a switching converter in accordance with an exemplary embodiment of the invention.
FIG. 7 depicts the switching converter of FIG. 6 in more detailed block diagram form.



DETAILED DESCRIPTION OF THE INVENTION
The invention is defined by the claims appended to this specification, and the following describes one or more particular modes of practicing the invention recited in the claims. Although the following description includes numerous details in order to provide a thorough understanding of the described mode(s) of practicing the invention, it will be apparent to those of skill in the art that other modes of practicing the invention recited in the claims need not incorporate all such detail except to the extent claimed.
The invention relates to a power conversion circuit useful, for example, in an IC tester 60 as depicted in FIG. 6. Tester 60 includes a host computer 62 communicating with a test head 64 via a computer bus 66. Before starting a test, host computer 62 sends program instructions to test head 64 via bus 66 defining the test signal patterns to be applied to an IC device under test (DUT) 68 during the test and indicating how the DUT's output signals are expected to behave. Test head 64 includes a number (N>1) of printed circuit channel cards CH1 through CHN, each for transmitting test signals to one or more input terminals of DUT 68, and for monitoring the DUT's output signals and stores test data indicating whether the DUT output signals behave as expected. After the test, each channel card CH1 through CHN forwards the test data to host computer 62 via bus 66
A power bus 74 distributes a DC power supply signal VBUS produced by an AC-to-DC, “off-line” converter 76 to each channel card CH1-CHN for powering components on the channel cards. To limit currents on bus 74, the VBUS supply voltage will be relatively high, for example 48 volts DC, but each channel card CH1-CHN includes circuits for converting the VBUS supply signal into the lower voltage supply signals it uses internally. Test head 64 also includes a power supply card 82 for converting the 48VDC VBUS signal into an output signal of voltage VOUT for driving the DUT's power input terminal 77. Power supply card 82 includes a switching converter 83 in accordance with the invention including an adjustable intermediate bus converter 84 for converting the VBUS signal into a lower voltage DC signal VIN, and a compensated point-of-use converter 86 driven by the VIN signal for producing an output signal of adjustable voltage VOUT coupled to the power input terminal 77 of DUT 68 via a transmission line 89.
Test specifications require that during the test, DUT 68 should operate with the voltage VDD at is power terminal held within some specified range of a selected set point voltage VSP. A bus interface circuit 88 responds to instructions from host computer 62 via bus 74 by supplying data DREF1 for specifying the desired set point voltage VSP. During the test, switching converter 83 monitors VDD and adjusts VOUT as necessary to keep VDD as close as possible to VSP.
FIG. 7 depicts example implementations of converters 84 and 86 of FIG. 6 in more detail, and models various load and transmission line impedances. Converter 86 applies its output signal voltage VOUT across a series combination of the impedance 40 of the signal path connecting converter 86 to DUT 68 and the varying DUT load impedance 42. The signal path impedance 120 attenuates VOUT to produce VDD which can vary as the DUT load impedance 122 varies during a test. To permit converter 86 to monitor VDD, a separate feedback path 87 (FIG. 6) feeds VDD back converter 86. Although impedance 124 of feedback path 87 attenuates VDD to produce a feedback voltage VFB supplied as input to converter 86, since the current of the feedback signal is relatively small compared to the current of the VOUT signal, attenuation is relatively small and predictable voltage of feedback signal VFB tracks the voltage of VDD much more closely than the voltage of VDD tracks that of VOUT. Thus converter 86 can monitor VDD by monitoring feedback signal VFB and can adjust VOUT as necessary to keep the voltage VDD near its selected set point VSP.
The example implementation of intermediate bus converter 86 as shown in FIG. 7 includes a feedback control circuit 92, a pulse-width modulator (PWM) 94, and a power converter 96 for converting the input signal VIN from intermediate bus converter 84 to the VOUT signal supplied to DUT 66 of FIG. 6. A DAC 90 in feedback control circuit 92 converts the DREF1 data from host computer 62 (FIG. 6) into a reference signal VREF1 indicating the desired set point voltage. Feedback control circuit 92 compares feedback signal VFB to VREF1 and produces a control signal VC1 telling PWM 94 to produce a pulse-width-modulated output signal VPWM1 having a duty cycle D1 controlled by VC1. Power converter 96 responds to VPWM1 by producing the VOUT signal in response to the VIN signal wherein the duty cycle D1 of VPWM1 controls the ratio VOUT/VIN.
Intermediate bus converter 84 includes a DAC 100 for converting the DREF2 data from the host computer into a control signal VPWM2, a PWM circuit 104 for producing a control signal VPWM2 having a duty cycle D2 controlled by VPWM2, and a power converter 106 that produces VIN in response to VBUS, where VIN/VBUS is a function of the duty cycle D2 of VPWM2.
Feedback control circuit 92 includes an amplifier 110 and a pair of filters 112 and 114. The VREF1 signal output of DAC 90 drives a non-inverting input of amplifier 110. Filter 112 couples the VC1 signal output to an inverting input of amplifier 110 while filter 114 couples VFB to the inverting input to amplifier 92. Filters 112 and 114 are suitably designed relative to path impedances 120 and 124 in a manner well-known to those of skill in the art to optimize a desired combination of converter performance criteria such as for example, audiosusceptibility, transient response, closed loop frequency response, noise immunity, and power dissipation. All such performance criteria depend to some extent on the duty cycle D1 of VPWM1. Thus filters 112 and 114 are suitably designed to optimize the desired combination of performance criteria when D1 is some particular value DX, such as for example 0.5. During system operation PWM circuit 94 will vary the value of D when the DUT load varies in order to keep VDD near the selected set point voltage VSP, but D will normally not vary over a wide range unless the load varies wildly. Since converter 86 is optimized for some particular value DX of D1, then to ensure that for any selected set point voltage VSP, the range of values of D1 should center about DX during the test so that converter 86 will exhibit substantially optimum performance. The range of values of D1 will center about DX for any selected set point voltage VSP when the magnitude of VSP/VIN=f (DX), given that for power converter 96, VOUT/VIN=f (D1). Control data DREF1 selects the set point voltage VSP and control data DREF2 selects the value of VIN. In accordance with the invention, the values of DREF1 and DREF2 are chosen such VSP/VIN=DX for each possible value of VSP 
Suppose, for example, VOUT is to have a range of 1 to 3 volts and that filters 114 and 114 are designed to optimize converter performance characteristics for a value of f(D1)=DX=0.5. We then provide an intermediate bus converter having an output voltage VIN range of from 2 to 6 volts. When the desired set point voltage VSP=3 volts, host computer 62 sets VREF2 so the VIN=6 volts and sets VREF1 so that VOUT is 3 volts when D1=0.5, thereby optimizing the desired combination of performance criteria. When the desired set point voltage VSP=2 volts, host computer 62 sets VREF1 so the VIN=4 volts and sets VREF1 so that the VOUT is 2 volts when D1=0.5, thereby optimizing the desired combination of performance criteria. When the desired set point voltage VSP=1 volt, host computer 62 sets VREF2 so VIN=2 volts and sets VREF1 so that VOUT is 1 volts when D)=0.5, thereby again optimizing the desired combination of performance criteria.
Depending on application, the power converter 96 may be implemented by any of a wide variety of well known pulse-width modulated power converters such as, for example, the buck converter of FIG. 4. For all power converters relying on pulse-width modulation, we can generally express VOUT/VIN as some function of duty cycle D:

VOUT/VIN=f(D)

For the buck converter of FIG. 4,

f(D)=D 

For a typical “boost” converter producing an output voltage VOUT that is higher than its input voltage VIN,

f(D)=1(1−D)

For a typical “buck boost” converter producing an output voltage that can be either higher or lower than VIN 

f(D)=−D/(1−D)

Other converters known to those of skill in the art, which may be used to implement converter 96, include for example sepic, flyback, forward, two-switch forward, active clamp forward, half bridge, push pull, full bridge, and phase shift converters, each of which has an output-to-input voltage ratio characterized by a function of the duty cycle D of its input pulse-width modulated signal.

Intermediate bus converter 84 of FIG. 7 is illustrated herein as employing a pulse-width modulated converter 106, but in the context of the invention, bus converter 84 functions as an adjustable power source and may therefore be implemented by any kind of power source that can produce a suitably adjustable DC output voltage VIN.
Those of skill in the art will understand that while FIG. 7 depicts one particular architecture for feedback control circuit 92, the invention can be implemented using other well-known feedback control circuit architectures.
Thus has been shown and described a switching converter powered by a power supply signal having a fixed voltage VBUS for producing an output signal of voltage VOUT supplied through a signal path 89 to a variable load impedance 122 to produce a load voltage VDD across the load impedance that remains as close as possible to a selected set point voltage selected by control data DREF1. The switching converter includes a power converter 96 for producing the output signal, wherein a ratio VOUT/VIN is a function of the duty cycle D1 of a pulse-width modulated signal VPWM1; a pulse-width modulation circuit 94 for generating the VPWM signal of duty cycle D1 controlled by control signal VC1; a feedback control circuit 92 for adjusting D1 to keep the load voltage VDD as close as possible to VSP; and power source 84 for supplying the input signal to the first power converter, wherein a ratio VIN/VBUS is selected by second control data. Data DREF2 selects a value of VIN for which the ratio VSP/VIN is substantially the same for all possible set point voltages VSP and is of a value for which switching converter performance is substantially optimal with respect to a selected combination of performance criteria.
Although the D-optimized switching converter in accordance with the invention has been illustrated above as used within an integrated circuit tester, those of skill in the art will appreciate that the switching converter can be employed in other applications in which a point-of-use converter is applied to highly dynamic loads and which may be subject to a wide range of set-point (under program control) voltages.

## Claims

1. A switching converter for producing an output signal of voltage VOUT supplied through a signal path (89) to a variable load impedance (122) to produce a load voltage VDD across the load impedance, wherein the switching converter adjusts the output signal voltage to keep the load voltage near a set point voltage VSP selected by input first control data (DREF1), the switching converter comprising:
a first power converter (96) powered by an input signal of voltage VIN for producing the output signal, wherein a ratio VOUT/VIN is a function of a duty cycle (D1) of a pulse-width modulated first signal (VPWM1) supplied as input to the first power converter;
a first pulse-width modulation circuit (94) for generating the first signal with its duty cycle (D1) controlled by a first control signal (VC1) supplied as input to the pulse-width modulation circuit;
a feedback control circuit (92), receiving the first control data and monitoring the load voltage, for adjusting the duty cycle of the first signal to keep the load voltage near the set point voltage selected by the first control data; and
a power source (84), receiving second control data (DREF2) for supplying the input signal of voltage VIN to the first power converter, wherein VIN is selected by second control data (DREF2).

2. The switching converter in accordance with claim 1
wherein the first control data can select any one of a plurality of set point voltages, and
wherein the second control data selects voltage VIN such that the ratio VSP/VIN is of the same value irrespective of which particular one of the set point voltages the first control data selects.

3. The switching converter in accordance with claim 1 wherein the power source comprises:
a second power converter (106) powered by a power signal of constant voltage VBUS for producing the input signal of voltage VIN, wherein a ratio VIN/VBUS is a function of a duty cycle (D2) of a pulse-width modulated second signal (VPWM2) supplied as input to the second power converter;
a second pulse-width modulation circuit 94 for generating the second signal with its duty cycle controlled by a second control signal (VREF2) supplied as input to the second pulse-width modulation circuit, and
a circuit (100) for producing the second control signal in response to the second control data (DREF2).

4. The switching converter in accordance with claim 1
wherein the first control data can select any one of a plurality of set point voltages; and
wherein when the first control data selects any one of the plurality of set point voltages, the second control data selects a particular value of VIN for which the duty cycle (D1) of the first signal will remain in a range that substantially optimizes a selected performance criteria with respect to load voltage response to variations in load impedance.

5. The switching converter in accordance with claim 4
wherein said range is substantially centered about that particular value (DX) for which the selected performance criteria is optimized.

6. A method for producing a load voltage (VDD) across a load impedance (122) that remains near a selected set point voltage VSP as the load impedance varies, the method comprising the steps of:
a. producing an output signal of voltage VOUT1 in response to an input signal of VIN, wherein a ratio VOUT/VIN is a function of a duty cycle (D1) of a pulse-width modulated first signal (VPWM1);
b. generating the first signal with its duty cycle (D1) controlled by a first control signal (VC1);
c. adjusting the duty cycle of the first signal to keep the load voltage near the set point voltage selected by the first control data; and
d. generating the input signal in response to a power signal of fixed voltage VBUS wherein a ratio VIN/VBUS is selected by second control data.

7. The method in accordance with claim 6
wherein the first control data can select any one of a plurality of set point voltages, and
wherein the second control data selects the ratio VIN/VBUS such that the ratio VSP/VIN is of the same value irrespective of which particular one of the set point voltages the first control data selects.

8. The method in accordance with claim 6 wherein step d comprises the substeps of:
d1. producing the input signal of voltage VIN as a function of a duty cycle (D2) of a pulse-width modulated second signal (VPWM2) supplied as input to the second power converter,
d2. generating the second signal with its duty cycle controlled by a second control signal (VREF2); and
d3. producing the second control signal of magnitude controlled by second control data (DREF2).

9. The switching converter in accordance with claim 1
wherein the first control data can select any one of a plurality of set point voltages, and
wherein when the first control data selects any one of the plurality of set point voltages, the second control data selects a particular magnitude of voltage VIN for which the duty cycle (D1) of the first signal will remain in a range that substantially optimizes particular switching converter performance criteria.

10. The switching converter in accordance with claim 9
wherein said range is substantially centered about a particular value (DX) for which the switching converter performance criteria is optimal.