Reference

I hi'ih'i" 0F STAND & TECH

A1110S

NBS

Publi-

-ations

82-2601, Parts i and U

OFFICIAL USE ONLY

Automatic Test Equipment

Calibration /Performance Verification

Evaluation and Research Program

(JLC/DoD Subtask 30702)

Part 11

U.S. DEPARTMENT OF COMMERCE

National Bureau of Standards

National Engineering Laboratory

Center for Electronics and Electrical Engineering

Electrosystems Division

Washington, DC 20234

U.S. DEPARTMENT OF COMMERCE

National Bureau of Standards

Electromagnetic Technology Division

Boulder, CO 80303

December 1982

Prepared for Logistics Commanders Panel on Automatic Testing

Joint Technical Coordination Group for Metrology

D Calibration Coordination Group

AF AS D/ AEG

6

MATE Program Office

NBSIR 82-2601, Parts I and II AUTOMATIC TEST EQUIPMENT

CALIBRATION/PERFORMANCE VERIFICATION

EVALUATION AND RESEARCH PROGRAM

(JLC/DoD SUBTASK 30702)

Part II

Thomas F. Leedy, Barry A. Bell, Paul S. Lederer

U.S. DEPARTMENT OF COMMERCE

National Bureau of Standards

National Engineering Laboratory

Center for Electronics and Electrical Engineering

Electrosystems Division

Washington, DC 20234

William L. Gans, Robert E. Nelson

U.S. DEPARTMENT OF COMMERCE

National Bureau of Standards

Electromagnetic Technology Division

Boulder, CO 80303

December 1 982

Prepared for Joint Logistics Commanders Panel on Automatic Testing

DoD Joint Technical Coordination Group for Metrology

DoD Calibration Coordination Group

USAF ASD/AEGB MATE Program Office

Rational bureau

Of STANDARDS

LIBRARY MAR 16

OCr\ CLCC

OC- i oo

• 5-Ls 0\

PT<9

U.S. DEPARTMENT OF COMMERCE, Malcolm Baldrige, Secretary

NATIONAL BUREAU OF STANDARDS, Ernest Ambler. Director

Preface

The work described in this report was performed in response to a request by the Joint Logistics Commanders Panel on Automatic Testing

(JLC/AT). The final report issued by the Industry-Joint Service "Automatic

Test Project" (June 1980) strongly urged NBS leadership for the metrology

and calibration support of automatic test equipment (ATE). The contents

of this report are the results of an initial attempt to respond to this

mandate.

As an organization, the National Bureau of Standards (NBS) has little

experience with large, multi -function automatic test systems. The Bureau

does not manufacture, procure, or use these systems. The strength of

NBS is in metrology, and it is this strength that was applied to

characterizing the performance of automated test systems. The work

reported here is experimental in nature. It does not constitute an evaluation, certification, or endorsement of any equipment or systems.

The experiment was to determine the feasibility of applying a portable

calibration standard at the interface of third generation ATE. There was

no attempt to technically evaluate the system measurement capability

beyond what is reported.

Third generation ATE is characterized by extensive use of computer

systems to implement signal generation and measurement within the equipment.

The system software required to program the computer is generally "invisible"

to the user of such systems. No attempt was made to understand the

system software in detail. Errors in such software could cause apparent

measurement errors. Additional software, the NBS test applications

programs, were written in ATLAS to actually implement the measurement

processes. Knowledge that the application software was completely errorfree or performed exactly as was intended is not certain.

The choice of the automatic test system for this experiment

(AN/USM-410 or EQUATE) was by mutual consent of representatives from the

U.S. Army, Air Force, and Navy. This particular system seemed a reasonable

candidate since each service used at least one such system and all could

profit by the work. No attempt should be made to compare the results

from the two test stations used in this experiment. This comparison

would be unjust i fed from several points of view. First, each service

uses their test system in a different manner and for different purposes.

The particular Army system tested is used primarily for testing field

communications equipment; the Navy station primarily tests digital logic

assemblies. Secondly, somewhat different maintenance and calibration

philosophies are applied by the various services. Thirdly, the test

stations are of different age, the Navy system being the oldest. The

age of the particular machine impacts both its hardware and software and

the maintenance experience used in its support.

It should be reemphasized that this work was entirely an experimental

investigation of a limited nature that was performed on only two automatic

test systems. Accordingly, any conclusions and recommendations in this

report reflect this limited sampling. Nevertheless, the results are probably representative of many automatic test systems and demonstrate

the value of using an "on-site" calibration support scheme to reveal

potential measurement problems.

i i i
TABLE OF CONTENTS

Page

Preface

LIST OF FIGURES vi

LIST OF TABLES xi

Abstract 1

1. INTRODUCTION 2

1.1 Background 2 1.2 Coordination Between Sponsors and NBS, and Within NBS 2

2. WORK PLAN 3

2.1 Objectives 3

2.2 Approach 3

2.3 Selection of ATE Systems and Parameters 4

3. INITIAL SITE VISITS TO ATE SYSTEMS 5 3.1 Visit to Navy ATE Systems at the Naval Air Test Center,

Patuxent River, MD 5 3.2 Visit to Army ATE Systems at the Army Depot, Tobyhanna, PA . . . 7 3.3 Visit to Air Force ATE Systems at Eglin Air Force Base, FL . . . 8

3.4 ATE Problems Discussed During Visits 9

3.4.1 Navy ATE 9

3.4.2 Army ATE 10

3.4.3 Air Force ATE 10

3.5 General Observations From ATE Visits 11

4. CHARACTERIZATION OF SIGNAL SOURCES 12

4.1 Selection of Sources 12

4.1.1 Selection of the DC to 10 MHz Source 12

4.1.2 Selection of the Pulse Source 13

4.2 Experimental Investigation of DC-10 MHz Source 13

4.2.1 Sensitivity of Source to Variations in

Power-Lirie Voltage 13

4.2.2 Long-Term Stability 14

4.2.3 NBS Traceability of the Source 15

4.2.4 Effects of Ambient Temperature 16

4.2.5 Start-Up Characteristics of the Source 17

4.2.6 Distortion of AC Signals 17

4.3 Characteri zati on and Calibration of NBS Pulse Source 18

4.3.1 NBS Automated Pulse Measurement System (APMS) 18

4. 3. 1.1 APMS Description 18

4. 3. 1.2 APMS Time Axis Calibration and Traceability ... 2U

4. 3. 1.3 APMS Voltage Axis Calibration and Traceability . 21 4.3.2 NBS Pulse Source Calibration 22

4. 3. 2.1 Calibration Procedure for the EQUATE DIU Interface 22

4. 3.2.2 Calibration Procedure for the EQUATE PIU Interface 23

4. 3. 2. 3 Calibration Data Acquisition and Analyses .... 24
TABLE OF CONTENTS (cont.)

Page

5. FIELD TESTS AND PERFORMANCE VERIFICATION OF ATE SYSTEMS 29

5.1 Field Test of the EQUATE System at the Army Depot, Tobyhanna, PA 29

5.1.1 Test Procedure Used From DC to 10 MHz 29

5.1.2 Test Procedure Used With Pulse Source 31

5.2 Test Data Collection and Analysis, Army 35

5.2.1 DC Signals 35

5.2.2 AC Signals to 50 kHz 36

5.2.3 Pulses 37

5.3 Field Test of the EQUATE System at the Naval Avionics Center,

Indianapolis, IN 38

5.3.1 Test Procedure Used From DC to 10 MHz 38

5.3.2 Test Procedure Used With Pulse Source 38

5.4 Test Data Collection and Analysis, Navy 40

5.4.1 DC Signals 40

5.4.2 AC Signals to 10 MHz 41

5.4.3 Pulses 41

6. RECOMMENDATIONS FOR FUTURE EFFORTS 42

6.1 Feasibility of Using Dynamic Transport Standards 43

6.1.1 Characteristics Desired 43

6.1.2 Calibration and Characterization Methods 44

6.2 Needs at NBS for Automated Calibration Support Systems 45

6.3 Recommendation for Future NBS ATE Efforts 46

6.3.1 Near-Term Extensions of Present JLC 30702 Project .... 47

6.3.2 Longer Range Program 48

7. ACKNOWLEDGEMENTS 49

8. REFERENCES 50

APPENDIX A. Listing of the ATLAS program DCV, ACVL, and

ACVH run on the Army EQUATE System 166

APPENDIX B. Listing of the ATLAS program DCV, ACVL, and

ACVH run on the Navy EQUATE System 172

APPENDIX C. Listing of the ATLAS program to acquire PIU pulse

measurement data on the Navy EQUATE System 177

APPENDIX D. A typical pulse measurement printout from the

PIU tests 181

APPENDIX E. Listing of the ATLAS program to acquire DIU pulse

measurement data on the Navy EQUATE System 182

APPENDIX F. A typical pulse measurement printout from the

DIU tests 184

v
LIST OF FIGURES

Rage

Figure 1. The change in the dc output voltage as a function of power

line voltage. Note that the x-axis is a logarithmic axis

in both the positive and negative directions. This convention

is used to display a wide range of dc voltages in several

of the plots that follow 52

Figure 2a. The change in the ac output voltage of the source with the

output at 1.0, 10.0, and 100.0 V and a frequency of 100 Hz . . 53

Figure 2b. The same as figure 2a except the output voltage is 10 kHz ... 54

Figure 3. The change of the dc voltage output at four selected voltages

over a period of approximately seven months 55

Figure 4. The change of the ac voltage output of the source at four

selected voltage and frequency combinations over a period of

approximately seven months 56

Figure 5. The difference, on two occasions, between the dc output

voltage of the source and the NBS Legal Volt as maintained

by the Electrical Measurements and Standards Division of NBS . . 57

Figure 6a. The interconnection used to determine the difference between

the NBS Legal Volt and the source for the voltage range of

10 to 200 V dc 58

Figure 6b. The interconnection used to determine the difference between

the NBS Legal Volt and the source for the voltage range of

0 to 10 V dc 59

Figure 6c. The system used to determine the ac voltage of the source in

terms of the dc voltage. Both the source and the voltmeter

may be controlled by means of the IEEE-488 interface 60

Figure 7a. The results of the ac-dc i ntercompari son over the range of

8 to 20 V ac and over the frequency range of 50 Hz to 50 kHz . 61

Figure 7b. The same intercomparison as shown in figure 6a performed

three months later 62

Figure 8. The limits in the changes of the output voltage of the source over the temperature range 0° to 40°C 63

Figure 9. The change in ac output voltage as a function of ambient

temperature 64

Figure 10. The change in the ac output voltage of the source as a function of time after the source is powered 65
LIST OF FIGURES (cont.)

Page

Figure 11. The total harmonic distortion and noise (THD + N) of the

ac source as a function of frequency and amplitude 66

Figure 12. NBS Automatic Pulse Measurement System (APMS) block diagram . 67

Figure 13. Typical run time terminal dialog for TCAL time axis

calibration program 68

Figure 14. Typical run time terminal dialog for VCAL voltage axis

calibration program 69

Figure 15. NBS/commerci al pulse source calibration configuration .... 70

Figure 16. Standard pulse terminology and definitions for a single pulse 71

Figure 17. Graphical determination of occurrence density A - pulse

waveform with superimposed grid. B- probability density

histogram 72

Figure 18. Typical run time terminal dialog for GMEAS pulse waveform

acquisition program 73

Figure 19. Typical run time terminal dialog for PWA2KA pulse waveform

analysis program 74

Figure 20a. 100 ns, 400 mV pulse with parameters determined from MIN-MAX

definition 75

Figure 20b. 100 ns, 400 mV pulse with parameters determined from

HISTOGRAM definition 76

Figure 21. 20 ns pulse measured directly at APMS sampler through 2 m length of RG-58C 50 coaxial cable (MIN-MAX definition) . . 77

Figure 22. Same pulse as shown in figure 21 with special NBS 3 mm SMA/twin lead adapter inserted at APMS sampler interface

plane 78

Figure 23. Same pulse as shown in figure 22 with EQUATE PIU connector

and twin lead/BNC adapter inserted at 3 mm SMA/twin lead

adapter interface plane 79

Figure 24a. NBS pulse source 50 ns pulse direct to APMS sampler with 5 ns NBS filter (MIN-MAX definition) 80

Figure 24b. NBS pulse source 50ns pulse direct to APMS sampler with

5 ns NBS filter (HISTOGRAM definition) 81
LIST OF FIGURES (cont.)

Page

Figure 25a. Same pulse as shown in figure 24a with addition of EQUATE PIU

connector and NBS adapters (MIN-MAX definition) 82

Figure 25b. Same pulse as shown in figure 24b with addition of EQUATE PIU

connector and NBS adapters (HISTOGRAM definition) 83

Figure 26a. NBS pulse source 100 ns pulse direct to APMS sampler with

5 ns NBS filter (MIN-MAX definition) 84

Figure 26b. NBS pulse source 100 ns pulse direct to APMS sampler with

5 ns NBS filter (HISTOGRAM definition) 85

Figure 27a. Same pulse as shown in figure 26a with addition of EQUATE

PIU connector and NBS adapters (MIN-MAX definition) 86

Figure 27b. Same pulse as shown in figure 26b with addition of EQUATE

PIU connector and NBS adapters (HISTOGRAM definition) .... 87

Figure 28a. NBS pulse source 200 ns pulse direct to APMS sampler with

50 ns NBS filter (MIN-MAX definition) 88

Figure 28b. NBS pulse source 200 ns pulse direct to APMS sampler with

50 ns NBS filter (HISTOGRAM definition) 89

Figure 29a. Same pulse as shown in figure 28a with addition of EQUATE

PIU connector and NBS adapters (MIN-MAX definition) 90

Figure 29b. Same pulse as shown in figure 28b with addition of EQUATE

PIU connector and NBS adapters (HISTOGRAM definition) .... 91

Figure 30a. NBS pulse source 500 ns pulse direct to APMS sampler with

50 ns NBS filter (MIN-MAX definition) 92

Figure 30b. NBS pulse source 500 ns pulse direct to APMS sampler with

50 ns NBS filter (HISTOGRAM definition) 93

Figure 31a. Same pulse as shown in figure 30a with addition of EQUATE

PIU connector and NBS adapters (MIN-MAX definition) 94

Figure 31b. Same pulse as shown in figure 30b with addition of EQUATE

PIU connector and NBS adapters (HISTOGRAM definition) .... 95

Figure 32a. NBS pulse source 500 ns pulse direct to APMS sampler with

5 ns and sharp-cutoff NBS filters (MIN-MAX definition). ... 96

Figure 32b. NBS pulse source 500 ns pulse direct to APMS sampler with

5 ns and sharp-cutoff NBS filters (HISTOGRAM definition). . . 97

vi ii
LIST OF FIGURES (cont.)

Page

Figure 33a. Same pulse as shown in figure 32a with addition of EQUATE

PIU connector and NBS adapters (MIN-MAX definition) 98

Figure 33b. Same pulse as shown in figure 32b with addition of EQUATE

PIU connector and NBS adapters (HISTOGRAM definition) .... 99

Figure 34a. NBS pulse source 1000 ns pulse direct to APMS sampler with

50 ns NBS filter (MIN-MAX definition) 100

Figure 34b. NBS pulse source 1000 ns pulse direct to APMS sampler with

50 ns NBS filter (HISTOGRAM definition) 101

Figure 35a. Same pulse as shown in figure 34a with addition of EQUATE

PIU connector and NBS adapters (MIN-MAX definition) 102

Figure 35b. Same pulse as shown in figure 34b with addition of EQUATE

PIU connector and NBS adapters (HISTOGRAM definition) .... 103

Figure 36. The interconnections between the source and the EQUATE

station. All cables are 50 ft impedance and have the

same length as used in the calibration of the source and

fixture 104

Figure 37. A histogram of the deviations from nominal (percent) for

all dc voltage observations 105

Figure 38. The error (percent) nominal plotted as a function of applied

voltage over the range of -195 to +195 V dc 106

Figure 39. The error (percent) nominal plotted as a function of

dc voltage over the range of -5 to +5 V dc 107

Figure 40a. The pin-to-pin reproducibility measured at +100 V dc .... 108

Figure 40b. The pin-to-pin reproducibility measured at -100 V dc .... 109

Figure 40c. The pin-to-pin reproducibility measured at -5 V dc 110

Figure 41. A histogram of the error (percent) for all ac voltage

observations Ill

Figure 42. The error (percent) for the ac voltage observations as a function of voltage. Notice the abrupt change in the points

at 7 V ac 112

Figure 43. The error (percent) for the ac voltage observations as a function of frequency. Notice the dispersion of points at

50 kHz 113
LIST OF FIGURES (cont.)

Page

Figure 44. A histogram of the error (percent) for all the dc voltage

observations 114

Figure 45. A histogram of all dc observations with those points removed

that were in error by more than 50 percent 115

Figure 46. The deviation from nominal plotted as a function of voltage

over the range of -195 V to +195 V dc 116

Figure 47. The deviation from nominal plotted as a function of voltage

over the range of -5 V to +5 V dc 117

Figure 48. The pin-to-pin reproducibility measured at -100 V dc 118

Figure 49. The pin-to-pin reproducibility measured at -5 V dc 119

Figure 50. The pin-to-pin reproducibility measured at +5 V dc 120

Figure 51. A histogram of the deviations of ac voltages as measured

by the EQUATE station with those points removed that were

in error by more than 50 percent 121

Figure 52. The error (percent) for the ac voltage observations as a function of voltage 122

Figure 53. The error (percent) for the ac voltage observations as a function of frequency. Notice the dispersion of points

at 50 kHz is to a lesser extent but similar in form to that

shown in figure 43 123

Figure 54. The error (percent) of ac voltage observations between

0.6 and 10 MHz 124

Figure 55. A time domain reflectometry signature of the 50 n DIU

BNC connector port to EQUATE 125

Figure 56. The time domain reflectometry signature of pin-pair 1 and

IS of the PIU input in the unbuffered mode 126

Figure 57. The time domain reflectometry signature of pin-pair 1 and

IS of the PIU input in the buffered mode 127

Figure 58. A Dynamic Transport Standard concept and support strategy.

Dashed lines indicate that the transport standard is

physically moved from one location to another 128

Figure 59. Dynamic Transport Standards for supplementing the present

ATE calibration hierarchy 129

x
LIST OF TABLES

Page

Table 1A. Manufacturer's specification for the dc source 130

Table IB. Manufacturer's specification for the ac source 130

Table 1C. Manufacturer's specifications for the wideband source 131

Table 2. Time synthesizer calibration - data log - 50 ns nominal .... 132

Table 3. Time synthesizer calibration - data log - 100 ns nominal . . . 133

Table 4. Time synthesizer calibration - data log - 200 ns nominal . . . 134

Table 5. Time synthesizer calibration - data log - 500 ns nominal ... 135

Table 6. Time synthesizer calibration - data log - special 500 ns nominal 13b

Table 7. Time synthesizer calibration - data log - 1000 ns nominal ... 137

Table 8A. DC voltage sequences used on Army EQUATE 138

Table 8B. Low-frequency voltage sequences used on Army EQUATE 139

Table 9. Sample printout of dc data, after reduction, from Army

EQUATE System 141

Table 10. Sample printout of ac data, after reduction, from Army

EQUATE System 142

Table 11. Pulse Measurement Data, April 1981, Army EQUATE System,

PIU Pins 1 and 11 144

Table 12. Pulse Measurement Data, April 1981, Army EQUATE System,

PIU Pins 44 and 28 145

Table 13. Pulse Measurement Data, April 1981, Army EQUATE System,

PIU Pins 120 and 92 146

Table 14. Pulse Measurement Data, April 1981, Army EQUATE System,

DIU BNC #1 147

Table 15. Pulse Measurement Data, April 1981, Army EQUATE System,

DIU BNC #2 148

Table 16. Pulse Measurement Data, April 1981, Army EQUATE System,

DIU BNC #4 149

xi
LIST OF TABLES (cont.)

Page

Table 17A. DC voltage sequence used on Navy EQUATE 150

Table 17B. Low-frequency voltage sequence used on Navy EQUATE 151

Table 17C. High-frequency voltage sequence used on Navy EQUATE 152

Table 18. Sample printout of dc data, after reduction, from Navy

EQUATE System 154

Table 19. Sample printout of ac data, after reduction, from Navy

EQUATE System 156

Table 20. Pulse Measurement Data, July 1981, Navy EQUATE System,

PIU Pins 1 and IS, unbuffered . 158

Table 21. Pulse Measurement Data, July 1981, Navy EQUATE System,

PIU Pins 1 and IS, buffered 159

Table 22. Pulse Measurement Data, July 1981, Navy EQUATE System,

PIU Pins 19 and 19S, unbuffered 16U

Table 23. Pulse Measurement Data, July 1981, Navy EQUATE System,

PIU Pins 19 and 19S, buffered 161

Table 24. Pulse Measurement Data, July 1981, Navy EQUATE System,

PIU Pins 58 and 58S, unbuffered 162

Table 25. Pulse Measurement Data, July 1981, Navy EQUATE System,

PIU Pins 58 and 58S, buffered 163

Table 26. Pulse Measurement Data, July 1981, Navy EQUATE System,

DIU BNC #1 using various pulse durations 164

Table 27. Pulse Measurement Data, July 1981, Navy EQUATE System,

DIU BNC #1 using various pulse durations 165

xii
AUTOMATIC TEST EQUIPMENT CALIBRATION/ PER FORMANCE

VERIFICATION EVALUATION AND RESEARCH PROGRAM

Thomas F. Leedy, William L. Gans, Barry A. Bell,

Paul S. Lederer, and Robert E. Nelson

Abstract

This work describes an experimental approach to verify the

performance of selected third generation automatic test systems.

The approach consisted of careful laboratory characterization

of two types of signal sources. One was a dc and low frequency

ac voltage source covering the range of approximately 100 mV to

200 V dc, and 300 mV to 1 40 V ac rms over a frequency range of

100 Hz to 10 MHz. The second source was a precision time

synthesizer used to generate pulses of known durations from 50 to

1000 ns. Both of these sources were used to verify the ability of

two automatic test systems to measure ac and dc voltages and time

intervals. The methods used to characterize these sources and the

measurement results of applying the sources to the two automatic

test systems are discussed in detail. Recommendations for future

efforts to improve the measurement capabilities and traceability of

automatic test systems are also presented.

Key words: ATE; automatic test systems; calibration; characterization;

dynamic transport standard; evaluation; field calibration; performance

test; third generation system.

1
1. INTRODUCTION

1.1 Background

Complex, high-speed ATE systems have unique calibration requirements

by virtue of their wide dynamic measurement range, their ability to both

supply and measure electrical signals, and their extensive use of computer

technology and software for the control of the systems.

The Department of Defense (DoD) is especially concerned that ATE

systems perform properly since such equipment is vital to assure readiness

of weapons systems. Additionally, to comply with MIL-STD-45662 , Calibration

System Requirements, DoD needs the calibration of ATE systems to be

traceable to national standards.

In recognition of the fact that automatic testing is an extremely

complex and highly dynamic technology, a Joint Logistics Commanders

Panel on Automatic Testing was established by the services in July 1979.

The Panel identified over 80 technical tasks needed to achieve its goals.

Task 30702, "Calibration of ATE," has the purpose to "determine and

develop concepts (policies, standards, techniques, practices and procedures)

for on-line and off-line calibration to verify performance of the DoD

family of ATE, with a special emphasis to be placed on performance

verification of third generation and later generations of ATE."

During Fiscal Years 1979 and 1980, several proposals addressing these

particular needs were submitted by NBS to the JLC/AT. Approval was gained for an experimental project, to be carried out jointly by staff

from the NBS Gaithersburg and Boulder laboratories, in the Center for

Electronics and Electrical Engineering (CEEE). The activity and results

obtained during FY 1980 and 1981 on this project are the subject of this

report.

It should be noted that the application of NBS sources to automatic

test equipment does not imply that the equipment is thereby traceable to

NBS standards. The measurements described in this report represent

experiments which were not performed with the statistical rigor of an NBS

calibration service.

1.2 Coordination Between Sponsors and NBS, and Within NBS

In the discussions which led to the acceptance of the NBS proposal by

JLC, it was agreed that representatives from the services would form a committee to help guide and monitor the NBS efforts and to provide the

necessary service contacts. This committee was of vital importance

in helping to gain access to military ATE systems.

As proposed, the NBS efforts were to cover two types of electrical

parameters with work to be carried out at the Gaithersburg and Boulder

laboratories where the necessary expertise resides.

In September 1980, a meeting was held at NBS Gaithersburg to discuss

the critical matters relating to ATE calibrations, and the plans for

conducting this project. The discussion included ATE testing and

2
traceability strategies and the division of the technical responsibilities

between the Electrosystems Division (Gaithersburg) and the Electromagnetic

Technology Division (Boulder). It was agreed that the former Division

would be responsible for ATE parameters related to dc and low frequency

ac, while the latter would be responsible for fast waveform (pulse)

parameters, with the possible addition of radio frequency and microwave

parameters in future years.

2. WORK PLAN

2.1 Objectives

The basic goal of this project was the establishment of techniques to

assure proper calibration of the ATE systems as used by the DoD.

Key objectives of this project for FY 1980 included:

(1) The selection of representative military ATE systems following

consultation with DoD representatives; (2) site visits, selection

of electrical parameters, and the formulation of plans for their on-site

measurement and verification; and (3) the preparation of procedures and

instrument packages at NBS laboratories to carry out such measurements.

The objectives for FY 1981 were:

(1) The procurement, testing, characterization, and calibration of

instruments for the field testing of selected ATE systems; (2) the conduct

of field measurements/verifications of ATE systems; (3) the analysis of

data and assessment of station performance quality; and (4) the planning

of a more comprehensive approach to ATE station performance verification

procedures.

2.2 Approach

The primary elements of the technical approach followed the objectives

stated above and can be summarized as follows. The first phase was the

selection (and possible modification) and laboratory characterization of

commercial signal sources. The selection of those sources was dictated

by the choice of ATE system to be investigated (i.e., its voltage,

frequency, or pulse measurement characteristics), as well as the availability

at NBS of adequate capability for characterizing the sources. Commercial

e availability, price, delivery time, and portability aspects were also

considered, as was computer control capability.

The second phase was that of field measurements and performance

verification of selected ATE stations. For this purpose, calibrated

sources with suitable interface adapters/connectors were taken to the

ATE station. The station was programmed to measure and record a range

of source output signals as applied to randomly selected pins on the

station interface panel. In this approach, the ATE station treats the source as a typical unit under test (UUT).

3
The third phase was the evaluation of the field measurement data at

NBS in the light of knowledge about the performance characteristics of

the sources. Based on this, conclusions could be drawn as to the actual

measurement capability of the ATE station. Additional observations about

station operation during the field measurements were also to be compiled.

It was recognized that these field experiments would represent only

a limited sampling of the measurement capability of selected ATE systems.

Therefore, the fourth phase of the approach was the development of a more comprehensive proposed program for assuring better measurement

capability and traceability of military ATE systems.

2.3 Selection of ATE Systems and Parameters

Based on a number of visits to various DoD ATE installations in the

Fall of 1980 (described in detail in section 3 below) two basic decisions

were made with the concurrence of DoD. The AN/USM-410 (EQUATE)^

ATE System was selected for on-site testing and evaluation. The primary

reasons for choosing this system were: (1) it is a third generation ATE

system using sampling techniques for virtually all measurements and

digital synthesis for most waveform stimuli; (2) it is used by all three

services; (3) it measures/generates a wide variety and range of signals;

and (4) it uses the IEEE Standard 41 6-1 978 ATLAS language. Following

this decision, efforts were made to obtain access to one or more EQUATE

systems in each of the three services. With the help of the service

sponsors committee, access was obtained to one Army and one Navy

installation. An extensive ongoing workload at the selected Air Force

installation necessitated postponing a field test of that particular

EQUATE system.

Following the selection of the EQUATE system, test parameters were chosen

based on the knowledge of its specified measurement capabilities, combined

with knowledge of the output capabilities of potential signal sources.

For the dc and low frequency ac work, it was decided to use dc voltages

from ±100 mV to ±200 V and ac voltages from 300 mV rms to 140 V rms

at frequencies from 50 Hz to 10 MHz. For the pulse work, pulse duration

over a range from 50 to 1000 ns was selected as the initial pulse

measurement parameter.

It should be noted that during the actual experimental work, both in the source characterizations and the field tests, it was not feasible to

obtain data over the entire amplitude-frequency spectrum. Further details

are presented in sections 4 and 5.

1 In order to adequately describe the systems and experiments discussed in

this report, commercial equipment and instruments are identified by

manufacturer ' s name or model number. In no case does such identification

imply recommendation or endorsement by the National Bureau of Standards,

nor does it imply that the material or equipment identified is necessarily

the best available for the purpose.

4
3. INITIAL SITE VISITS TO ATE SYSTEMS

Early in the program, and with advice and guidance from the military

representatives for JLC Subtask 30702, several suitable ATE systems

were selected and visited by NBS personnel. It was considered desirable

to visit at least one ATE system for each of the services in order to

see the systems in operation, to talk to the personnel associated with

the systems, become aware of the operational environment, and to become

generally familiar with the hardware. These visits are discussed next

in the chronological order in which they were made.

3.1 Visit to Navy ATE Systems at the Naval Air Test Center,

Patuxent River, MD

On September 10, 1980, staff from both NBS laboratories visited

Cerberonics, Inc., a consulting firm to the Naval Aviation Logistics

Center, and also the Patuxent River Naval Air Test Center. At the first

stop (Cerberonics), the old and new versions of the Navy's weapon system

test station, CAT- 1 1 1 -D and CAT- 1 1 1-D( VI ) , respectively, were discussed

with staff of the Naval Aviation Logistics Center and of Cerberonics, Inc.

The CAT- 1 1

1 -D (AN/USM-429) is a computerized automatic test station designed

to perform end-to-end fault isolation testing of Navy avionic subsystems

or electronic ground support equipment. The CAT systems are made by

Grumman to support the F-14 aircraft, and basically consist of a number

of programmable stimulus and measurement instruments controlled by a Hewlett-Packard minicomputer over a custom control/data bus. The primary

application of the CAT systems is for digital circuit card testing and

fault isolation in an interactive mode. The major differences in the

new version, not yet completed, will be different stimulus/measurement

instrumentation, newer and more sophisticated minicomputer hardware and

software, and Manchester bus fault isolation via color graphics terminal

display. There are 36 old version CAT- 1 1 1 -D systems in use in the field

at present, which were deployed about 1974-75.

The CAT-III-D test station, which contains some off-the-shelf commercial

components, is housed in a three-bay equipment rack with all components

fully accessible from the front of the station. The stimulus functions

of this second-generation ATE system are provided by a commercial pulse

generator (HP-1 900A) and a function generator (Wavetek 154). The

measurement functions are carried out by a commercial multi-functional

digital meter (HP-3450B) and a counter/timer (HP-5326A). This system

was the first of several which were observed that employ a two-step

calibration procedure. First, a set of "core" instruments is removed

from the station and calibrated conventionally -- in this case the digital

multimeter and the counter/timer. Then, a system verification and self-test

program is run to check the other instrumentation against the core instruments and to verify the overall system operation. Grumman is in

the process of doing a "calibration and measurement requirement study"

for both CAT systems with the intent of generating a calibration procedure

to be applied to the UUT interface plane compatible with both versions

of CAT. As part of this study, Grumman is to provide a prototype interface

plane calibration unit that will be programmable and probably contain

sources (active circuits).

5
This system was also the first of several which were observed that

use a number of "adapter boxes" between the multipin (528-pin) ATE

interface plane and the particular UUT. In the case of the CAT- 1 1

1 -D

systems there are about 90 such boxes, each supporting one or more

individual UUTs. This is the most common solution to the problem of

adapting, in some cases, hundreds of different UUTs to a single multipin

ATE interface connector. Typically, both UUT drive power and test signals

are routed through the interface connector/adapter box to and from the

UUT.

Following this discussion, the NBS staff members visited the Patuxent

River Naval Air Test Facility and were shown three different Naval ATE systems.

In addition to an operational CAT-III-D, we saw a Hybrid Automatic Test

System (HATS, AN/USM-403) and a Versatile Avionic Shop Test System (VAST).

The HATS system, built by General Dynamics and programmed by Lockheed,

is an analog/digital card tester and fault isolator. It operates with

the ATLAS high level ATE language and contains almost no commercial

off-the-shelf stimulus/measurement instrumentation. It is a third generation

ATE sytem with programmable interface units (PIU) which, under computer

control, either apply a stimulus to the UUT or feed the UUT output to

the measurement system in the station. The latter is the Sampling Measurement

System (SMS) which provides the functions of digital voltmeters, counter/timers,

waveform analyzers, spectrum analyzers, and phasemeters under computer

program control

The HATS system is similar to the CAT systems in that it has a non-standard control/data bus (a Varian minicomputer and ATLAS compiler). The

HATS system also has a multipin interface (160 universal pins, individually

programmable as stimulus or measurement channels, and 160 pins dedicated

to measurement only). Some additional pins for power supplies and other

functions are also provided. The interface connector is an ITT Cannon

Electric (DL 110959) with 2496 contacts. This system is used with a multitude of adapter boxes, and relies on a two-step calibration procedure.

In this case the "core instrument" for calibration is a 16-bit D/A converter.

Complete calibration of the HATS system is seldom performed because it

is too difficult and time consuming. Also, according to the operators

the system is very difficult to operate properly due to overheating

problems in the "War Wagon," their term for the interface plane unit and

associated circuitry.

Calibration information in the HATS specification (GS 12436) states

in section 3.6.4 "... units requiring external calibration, including the

internal standards, shall be readily accessible and removable ... minimum

time between required calibrations shall be 1000 operational hours..." A

hardware description (appendix A, section A-57) in reference to the SMS

states "... A reference voltage calibration service is available in

the PIU to provide an end-to-end calibration of any input." Finally,

appendix C refers to an integral dc voltage reference, programmable with

16-bit resolution (0.003 percent accuracy). An ac reference source is

said to be corrected by comparison to the dc voltage reference through

an internal thermal converter.

6
The VAST system has been deployed since about 1967 and is the oldest

station that was observed. It was also by far the largest, consisting of

about 30 full-size racks of mostly non-standard instrumentation. It is

controlled by a Varian minicomputer and is programmed only with assembly

language. Built by PRD, there are three or four of these systems on each aircraft carrier and in numerous shore installations. It is used

primarily for avionics system testing for the A7 and S3 aircraft. Like

the CAT and HATS systems, the large number of adapter boxes actually

occupy more space than the system itself. Also, like the CAT and HATS,

a small number of core instruments are pulled periodically for external

calibration, followed by a daily system self-test and verification program

run.

3.2 Visit to Army ATE Systems at the Army Depot, Tobyhanna, PA

On September 12, 1980, the same NBS staff members visited the Army

Depot in Tobyhanna, Pennsylvania. This depot is a primary maintenance

facility for Army electronic equipment, as is the depot at

Sacramento, California. The depot is under DESCOM (Headquarters at

Chambersburg, PA), which in turn is one of the organizations under DARCOM

(Army Material Development and Readiness Command) Headquarters at

Alexandria, Virginia. At the site NBS staff were shown two of the Army's

ATE systems, the EQUATE system (two versions )and the BIGF00T system.

EQUATE (AN/USM-410) systems built by RCA are used for analog/digital

circuit card testing and fault isolation, and instrument testing and

calibration. Both systems use a Data General minicomputer and peripherals,

operate with ATLAS and have stimulus/measurement instrumentation for dc,

ac, low frequency, pulse, and RF tests. At Tobyhanna there were two

old EQUATE systems in operation and one new one, currently undergoing

evaluation. Aside from a more sophisticated computer system, both versions

of EQUATE are quite similar. As opposed to most of the Navy and Air

Force systems, test and calibration programs are written for the EQUATE

system on-site by Army personnel. Throughout the Army, these systems

support about 22,000 different line items in the areas of communications

and radar. EQUATE is similar in concept to HATS, being a thi rd-generation

ATE system, and interfacing with the UUT through a programmable interface

unit (PIU) and/or through a dedicated interface unit (DIU).

The EQUATE station includes programmable standards for ac and dc

voltage, resistance, and frequency. The outputs are available at front

panel connectors as well as being available internally for calibration of

the measurement subsystems. The programming language is EQUATE ATLAS.

The station is capable of calibration and performance verification of

certain stimulus/measurement functions. The calibration programs can be

used with ancillary calibration standards if required to reduce long-term

measurement system errors in gain, attenuation, linearity, frequency

response, and quantization. EQUATE uses built-in programmable secondary

standards which are removable for calibration in a standards laboratory.

The system was initially conceived as a quality acceptance tool, hence

the acronym EQUATE (Electronic Quality Assurance Test Equipment), to

provide capability for performing quality acceptance testing of electronic

7
devices and systems at a manufacturer's plant without resorting to sampling

plans. The basic test system has the capability of performing diagnostic,

fault-isolation testing, as well as performance testing.

The EQUATE systems, as configured at Tobyhanna, consist of a control

subsystem, a 650-pin programmable interface unit ( P IU ) , a dedicated interface

unit (DIU), and an optional RF/microwave unit. Physically, the system contains

five, 5-ft high rack panels plus control keyboard/CRT terminals. The

specifications for the EQUATE station claim the capabilities of measurement

of ac and dc voltages to 200 V with a maximum accuracy of 0.1 percent.

The accuracy decreases with frequency until at 500 MHz the claimed accuracy

is 4 percent. Measurements of current, resistance, and impedance can

be performed, as well as frequencies up to 500 MHz in the basic EQUATE

system, and up to 18 GHz using the optional RF/microwave unit. A wide

variety of other test capabilities are available on EQUATE, including AM

and FM modulation measurements, RF power measurements, spectrum analysis,

network analysis, phase-angle measurement, and digital data measurements.

All measurements are under computer control by which is claimed the

capability of providing for calibration and performance verification of

the system hardware stimuli and measurement functions. The test station

has integral programmable secondary standards for ac (up to 1 MHz) and

dc voltage (10 mV to 1000 V ranges), resistance (900 ft to 9 Mft),

and frequency (5 MHz).

Another ATE system briefly examined was BIGF00T (HP-9850), used

primarily as a transceiver tester. Like EQUATE, it can perform tests for

dc, low frequency ac, pulse, and RF, but, unlike the EQUATE, it consists

almost entirely of commercial equipment, and operates with the IEEE-488

standard control/data bus. There are two such systems on site, one having

just arrived. The ATE personnel seemed to prefer the BIGF00T system to

the EQUATE for transceiver testing, citing easier operation and higher

UUT throughput.

3.3 Visit to Air Force ATE Systems at Eglin Air Force Base, FL

On September 17, 1980, NBS staff visited Eglin Air Force Base and were shown two of the Air Force's ATE systems -- the TEWS TITE system

and a set of three older systems.

In terms of function, all four systems are used to support avionics in

the F-l 5 aircraft. The TITE system is used for electronic warfare (EW)

equipment, while the three older systems are used for microwave testing,

on-board computer testing, and display testing. These systems reflect

an AF philosophy of building ATE dedicated to supporting one particular

weapons platform. Thus, the four systems seen are dedicated completely

to support of the F-l 5 and are designed to be portable. They then go

wherever the fighter wing is deployed, on short notice, along with the

support personnel. The TITE system is built by McDonnel 1 -Dougl as , with

Bendix and Honeywell as subcontractors. It consists of a Honeywell 316

minicomputer with peripherals, and a variety of commercially available

stimulus/measurement instrumentation mounted in standard racks. Included

are such items as a Digital Multimeter (Fluke 8375A), a Programmable

8
Pulse Generator (Wavetek 154), and a Programmable Digital Processing

Oscilloscope (DPO) (Tektronix 7704A). The station has dc, low frequency

ac, pulse and RF capabilities similar to the Army's BIGFOOT and EQUATE

systems. It is programmed in assembly language (DAP-16) as well as ELAND. It has a multipin interface plane and numerous adapter boxes.

The system is quite new and has not yet won the acceptance of site

personnel. Three TITE systems, two in 24 hour/day operation and one currently being installed, were observed. As with all the ATE systems

seen, the two-step, core-instrument approach to system

calibration/verification is utilized. Also, like the EQUATE system, the

RF/microwave section is a separate unit with its own interface plane,

typically type "N" connectors, and must be connected externally to the

UUT. The TITE system is the only one with a built-in DPO used as a core instrument. It was noticed that the stations contain a source of cooling

air to cool the line replacement units (LRUs) under test to permit them

to operate as they do in the aircraft.

The set of three older systems are really slight modifications of one single system. They all are built around a Bendix 6200 20-bit

minicomputer system. Two stations are used for microwave testing, two

for on-board computer testing, and two for on-board display testing.

The systems are in continuous operation and have all been operational

for several years. They appear to have many of their bugs already worked

out, or accounted for, by site personnel.

3.4 ATE Problems Discussed During Visits

Among the objectives of the visits to military ATE stations was the

uncovering of problems, primarily relating to measurements performed by

the station. The information obtained is summarized in the sections

below. It should be noted that station operating and supervisory personnel

at all the installations were very accommodating in showing NBS staff

the ATE stations and frank in discussing equipment problems.

3.4.1 Navy ATE

A problem in the CAT-III-D system is that the measurement devices are removed from the station for calibration and upon return are used to check

the built-in function generators. This procedure has two drawbacks:

first, there is no independent calibration or test of the function

generators, and, secondly, there is no method of accounting for the

effects of interfaces and cabling and switching networks on the

measurements. These drawbacks pose a problem at the higher ac frequencies

and at fast pulses such as are encountered at the 10 MHz bit-rate of the

word generator. Interface device compensation is not done. There are about 90 different interface devices or boxes to connect the UUT to the

ATE. It may be possible to calibrate, in-place, the measurement components

in the CAT-III-D station with an external standard by running the system

in its "wraparound" self-check mode. Normally, in this mode, the externally

calibrated DVM and counter/timer core instruments are used to measure

selected outputs from the function generator and the pulse generator to

9
verify their proper operation in the station. Alternatively, by

disconnecting these generators and applying stimuli from an external

standard, the two measurement instruments could be calibrated in-place

with appropriate changes in the self-check software. The advantage of

this scheme is the availability of a wraparound test adapter box and an existing self-check computer program, both of which the Naval Air Test

Center claims to have.

The major problem in HATS is heat buildup in PIUs which can actually

damage the circuit boards. The HATS station at NATC is operated with

rear panels open and an outside fan blowing air into the station. In addition, an exhaust duct removes hot air from the top of the station.

Some calibration interface boxes for HATS permit the measurement of single

parameters by providing access to dedicated pins. To run the calibration

using a calibrated signal source would require writing a special UUT

test program for this station. Additionally, a special calibration test

adapter would need to be built.

3.4.2 Army ATE

A typical test sequence performed by the EQUATE system on a radio

(TR-524) commonly used by the Army was witnessed. It was mentioned that

there are approximately 25,000 of these radios deployed worldwide with

about 5,000 sent to Tobyhanna for repair and alignment per year. A

calibration of the radio takes approximately 25 minutes and includes

sensitivity tests, frequency checks, and distortion measurements. The

operating personnel have an annoying problem with interference being

picked up by the radio from the keyboard/CRT terminal controlling the

EQUATE system. This pickup makes the tests for receiver sensitivity

nearly impossible, since in some cases the radio may receive more RF

input from the terminal than it gets from the RF signal source supplied

by EQUATE.

3.4.3 Air Force ATE

A wide variety of problems were discussed by TITE station operators

and their managers. The problems include technical as well as managerial

ones. It was pointed out that operator training is not adequate to assure effective operation of those stations. Station personnel commented

that equipment is placed in service without adequate support. Very

little consideration is given to auxiliary equipment -- no logic state

analyzers, signature analyzers, and similar devices are supplied to help

debug the stations. Since the conventional IEEE-488 bus is not used

internally, future adaptation and modifications of the station will be more difficult.

Some of the units under test generate considerable amounts of RF

interference, which can preclude the measurement of other low level signals

by the station. Two other complaints cited were noise on signal ground

lines, and the fact that the digital processing oscilloscope requires an 8-hour adjustment period after it is put back into the station following

re-calibration. In general, calibration processes for TITE are considered

to be in preliminary form only, and are considered to require clarification

*

10
and elaboration. Ideally, one would like to require the periodic calibration

of only certain core items in the station prior to station operational

use. Some problems were experienced in the internal counter/timer when

operated under software control.

Another universal complaint was frequently encountered during visits

to other ATE installations and meetings with ATE people: the basic

problem is perceived to be the lack of communication and interaction

between weapons system designers, ATE station designers, and the

metrologists concerned with the calibration requirements for the ATE

stations.

3.5 General Observations From ATE Visits

Based on the above visits and discussions with site personnel, both

military and industrial, a few general observations may be made.

Although they are based on a limited sampling of ATE stations, these

observations may be applicable to many such systems.

All of the systems seen had a few common features. They all

allow the operator to connect the UUT to the ATE system, usually through

an adapter box, and execute test or fault isolation programs from a keyboard/video display. They all use a multipin interface plane for dc,

low frequency ac, and pulse stimulus/measurement connections to the UUT.

Differences in these systems, however, would present a number of

problems in terms of establishing practical consistency with NBS

standards. These include:

(1) Different stimulus and measurement instruments, including

standard commercial devices, specially modified commercial devices,

and custom-built instruments.

(2) Different, and inadequately defined, parameter ranges for stimuli

and measurements.

(3) Different, and inadequately defined, accuracy and precision

requirements. For example, the accuracy specifications as a function of operating environment for the ATE stations are often lacking.

(4) Different interface connectors, making it impossible to use a unique

external standard without specifically dedicated connectors

for each type of ATE.

(5) Different computer systems, software and memory media.

(6) Different control /data bus interfaces.

(7) Different degrees of software accessibility by the site (or

NBS) personnel , and

(8) Different industry and site philosophies as to exactly what actions

constitute an ATE system calibration.

11
Finally, the measurement uncertainties caused by the electrical

characteristics of a multitude of undefined interface-plane adapter

boxes could have significant impact on ATE performance. Such problems

include possible ground loops, stray capacitances, RF pickup, cross-talk,

and the generation of thermo-electric and other parasitic signals.

To be effective, a program for establishing techniques to assure

proper calibration of ATE systems in DoD must address or consider all of

these problems.

4. CHARACTERIZATION OF SIGNAL SOURCES

4.1 Selection of Sources

4.1.1 Selection of the DC to 10 MHz Source

An important part of this project was the selection of a stable

source of dc and ac voltages that could be applied as stimuli to ATE

stations under test. Several alternatives were considered which included

the design and construction of a suitable source at NBS, the assembly

of a package of commercial instruments that would provide the stimuli,

and the use of a commercial meter calibrator. The last alternative was adopted since meter calibrators are available commercially and time

restrictions did not permit the development of an NBS-designed package.

One was identified as having sufficient range and accuracy to demonstrate

the concept of a transportable standard that can be brought to an ATE

station.

An advantage of using the meter calibrator chosen as a source is

the ability to program its output in three ways: (1) the output can be

manually controlled via a keyboard data entry system; (2) the output

voltage can be selected by an internal tape cassette unit which is

preprogrammed to provide various outputs; and (3) the desired output

can be selected via an IEEE-488 interface. The IEEE-488 interface can select an output voltage in response to commands from a computer or instrument controller. All three data entry techniques were used with

the source in this project. This source was programmed over an IEEE-488

bus for the collection of data that was used to determine the source stability. The tape cassette was programmed with the test sequences

that were applied to the EQUATE stations, and the manual data entry

system was used for program checkout and for debugging.

The manufacturer's specifications of the selected source for ac and

dc voltages are given in tables 1A through 1C. One important objective

of this project was the verification of the performance of the source under various environmental influences that might be significant in

field use. For example, the accuracy of dc voltage and its stability

were determined from 0.01 to 200 V even though the source can provide a wider range. The more limited range of verification was chosen to correspond

to the measurement range of the EQUATE station. This effort was necessary

to ensure that the calibrator would produce predictable outputs over the

use and environmental conditions that would be encountered in the field

tests at EQUATE stations. The procedures and results of each of these

tests are presented in section 4.2 below.

12
4.1.2 Selection of the Pulse Source

The Initial NBS tests of the EQUATE station to measure the pulse

parameter known as PULSE DURATION required a commercially available,

stable, portable pulse generator that could be used as a calibrated

transfer standard. The unit chosen, called a "time synthesizer" by the

manufacturer, has the following characteristics:

(a) Portable (<15 kg) and capable of being mounted in a standard

19-in rack environmental shipping container.

(b) Capable of being controlled by an IEEE-488 data bus.

(c) Digital control of pulse time parameters, as opposed to continuous

vernier control, to allow accurate, repeatable parameter settings both in

the laboratory and in the field.

(d) An accurate, stable internal time reference standard consisting

of a 10 MHz crystal oscillator with a drift rate of <5 x 10"^ per day.

(e) An output pulse with amplitude variable from 0.5 V to 5 V, first

and second transition durations (rise and fall times, respectively) of

<5 ns, and pulse durations variable from 5 ns to 160 ms in 50 ps minimum

step sizes.

(f) Absolute pulse duration accuracy of ±(1 ns + time base error)

and a maximum jitter of 200 ps rms of the main pulse output with respect

to the synchronization output.

This unit was procured in early 1981 for use as a prototype pulse

duration transfer standard. Although the unit was controlled manually

from the front panel for initial work reported here, it is anticipated

that the IEEE-488 bus interface will be used for automatic control of

the unit in the future.

4.2 Experimental Investigation of DC-10 MHz Source

4.2.1 Sensitivity of Source to Variations in Power-Line Voltage

The power-line voltage in industrial environments, such as sites

where EQUATE stations may be located, is subject to change. Generally

such changes are not large or rapid. However, the power-line voltage may

vary several percent over a period of several hours. Thus, it was deemed

necessary to explore the effects of power-line voltage on the output of

the source.

The source was preset at the factory by means of a selector

switch to operate at a nominal power-line voltage of 115 V ac. This switch

accommodates various nominal line voltages. The specifications of the source apply at 115 V ac ±10 percent over a frequency range of 50 to 60 Hz.

To verify that the output voltage of the source would remain stable over

a range of input voltages, the following procedure was employed. The

power line of the source was connected to an autotransformer which could

vary the line voltage of the source from 0 to 140 V ac. A precision

13
digital voltmeter was connected to the output of the source and output

readings were recorded at various line voltage inputs from 90 to 140 V ac. This test range intentionally exceeded the ±10 percent specification limit

of 115 V ac (103.5 to 126.5 V ac). The source was programmed to provide

10 dc voltages of plus and minus 0.01, 0.1, 1.0, 10.0, and 100.0 V dc.

Figure 1 shows the results of this test. This plot gives the deviation

of the output voltage of the calibrator, in ppm, from the nominal value

observed at 115 V ac line voltage for each of the 10 dc voltages. The

assigned uncertainty of output voltage due to line voltage is 25 ppm over a voltage range of -200.0 to -0.1 V dc and +0.1 to +200.0 V dc.

The uncertainty assigned to the voltage -0.1 to +0.1 is 50 ppm. The

largest deviations in the output were observed at the ±0.01 V dc

levels. This probably resulted from temperature differences within the

measurement system. During these tests a period of ten minutes was allowed after each line voltage change for the calibrator to reach

thermal and electrical equilibrium.

Similar procedures were used to test the ac (rms) output stability

of the source over the same range of line voltages. The source was programmed to provide output voltages of 1.0, 10.0 and 100.0 V ac at

100 Hz and 10 kHz. The uncertainties assigned to the output of the ac voltage due to line voltage is 150 ppm over all voltages and frequencies

measured. Figures 2a and 2b show the observed deviations in ac output

voltage at these two frequencies as a function of line voltage.

4.2.2 Long-Term Stability

To assure that the calibration of the source would be valid over an extended length of time, the stability of the source/voltmeter combination

was measured for ac and dc voltages from January 26 through August 18, 1981.

During this period, a total of 72 dc observations were made at an average

interval of 2.8 days, using a programmable systems-type 6 1/2 digit

meter. The meter was used in the mode claimed by the manufacturer to

provide highest accuracy for a period of 90 days. In that mode measurement

uncertainties are specified by the manufacturer to be less than 100 ppm

on the 0.1 to 100.0 V dc ranges and less than 3400 ppm on the ac voltage

ranges for frequencies from 50 Hz to 50 kHz.

Both the source and the voltmeter were programmed via the IEEE-488

bus to automate the data collection process. A graphic computing system

containing 24 K bytes of semiconductor memory and an integral 300 K byte

tape cassette was programmed to control the source and voltmeter during

these tests. For example, dc voltages were monitored using a program

that generates a sequence of voltages and measures each of the voltages

ten times. The average, standard deviation, and average error of these

ten readings were then recorded on a magnetic tape cassette. The sequence

of voltages started at +0.00 V dc and progressed in 0.01 V dc increments to

0.1 V dc, then continued in 0.1 V dc steps to 1.0 V dc, and so on. At

+200 V dc the sequence was reversed until -200 V dc was reached, then

reversed again to return the source to -0.01 V dc. In this manner 154 dc

voltage outputs of the source were measured and recorded on the tape

cassette for subsequent analysis on the NBS central computer facility.

14
AC voltage data were collected in a similar manner except that five

measurements were made at each of 63 voltage/frequency combinations. The

test voltages ranged from 0.3 to 140 V ac at frequencies from 50 Hz to

50 kHz. Not all voltage/frequency combinations were tested since the

maximum output from the source was 70 V ac at 20 kHz and 7 V ac at 50 kHz.

Figure 3 shows the errors that were recorded for a set of four

different dc voltages over the seven-month test period. Using the data

from 252 observations, a 3o uncertainty of 55 ppm was assigned to the

dc voltage of the calibrator as measured by the precision voltmeter over

a seven-month period. The data shown for observation number 28 are not

anomalies, but resulted from making voltage measurements when the source

and voltmeter were not in temperature equilibrium. These measurements

were made less than an hour after the instruments were exposed to low

ambient temperatures during the field visit to Tobyhanna Army Depot.

Figure 4 shows the errors observed during the same seven-month

period for four voltage/frequency ac outputs from the source. Over the

seven-month period, 264 observations yielded a 3a uncertainty of approximately

1720 ppm as measured by the digital voltmeter. In the next section, it is

shown that, when measured by independent tests, the drift of both the

ac and dc source was small compared to that measured by the voltmeter.

It was thus concluded that the major drifts shown in figures 3 and 4 were due to a time instability of the voltmeter. It should be noted

that there are six fewer observations for ac voltages than for dc voltages.

This lapse in time (approximately ten days) was the time required to

write and debug the software for recording and analyzing the ac time-stability

data. Throughout this report the term "error" or "departure from nominal"

is defined as that fraction:

E rror s (Applied Voltage) - (Observed Voltage)

(Observed Voltage)

When expressed in ppm, the fraction is multiplied by 106 . The fraction

is multiplied by 100 to express percentage error.

For both the ac and dc measurements, interconnection between the

source and the voltmeter was made with a 6-ft length of RG-58C/U cable.

This is the same length and type of cable used to interconnect the source and the ATE system during subsequent field tests. In addition,

the traceability and distortion measurements described below were made at

the end of the cable and interface connector combination, i.e., right at

the output connector pins.

4.2.3 NBS Traceability of the Source

The dc output of the source was intercompared twice to the U.S.

Legal Volt, maintained by the Electrical Measurements and Standards Division

of NBS. This standard presently has an uncertainty of less than 1.0 ppm

and intercomparisons are possible to this level. Normally, comparisons

are made in the range of 0.015 to 10 V dc. The first comparison was made

on March 19, 1981 to calibrate the source over a range of 0.01 to 10 V dc.

Five months later, the source was again compared to the NBS Legal Volt to

determine if the former had drifted significantly. For the second comparison.

15
the calibration range for the source was extended to 200 V dc by special

arrangement with the Electrical Measurements and Standards Division.

The data obtained during both calibrations are shown In figure 5. From

these data, 3o uncertainty of 38 ppm was assigned to the time stability

of the dc voltage source as compared to NBS standards over a range of

0.10 V to 200 V dc. The experimental apparatus used for these determinations

Is shown schematically in figures 6a and 6b.

The ac voltage of the source was measured as a function of amplitude

and frequency by means of an NBS "Type F" set of ac-dc thermal voltage

converter standards. The ac voltage to be measured Is impressed across

the heater which raises the temperature in a bead insulator and thermocouple.

The resulting temperature change may be recorded by measuring the thermal

emf of the thermocouple output. Next, a dc voltage is applied to the

heater and its value Is adjusted to give the same thermocouple output

emf. If the ac and dc impedances of the thermal heater circuit are equal, then the dc voltage will be equal to the rms value of the ac voltage. The ac-dc difference tests consisted of determining the differences

between the voltage required to give the same output from the thermal

voltage converter standard on alternating current and on the average of

forward and reversed direct current. The experimental arrangement used

to Implement the ac-dc transfer is shown in figure 6c. The ac and dc

voltages of the source are available at the same output terminals by

programming the source over the IEEE-488 bus. The output of the thermal

converter is measured by the digital voltmeter, also controlled by the

bus. In this manner, full control may be exercised over the generation

and application of ac and dc voltages to the converter and over the

recording of the resulting thermocouple emf voltages. A multiplier

(current scaling) resistor, inserted between the source and the thermal

converter, allows the thermo element to be used over a voltage range of

2 to 600 V ac.

Figures 7a and 7b are plots of the observed change in output of

the ac voltage source on two dates approximately three months apart as determined by the ac-dc difference method. The voltage and frequency

range of the data presented is 8 to 20 V ac, and 50 Hz to 50 kHz,

respectively. From these 69 observations, the source was assigned a 3a uncertainty of 93 ppm for stability over a three-month period.

4.2.4 Effects of Ambient Temperature

Changes in temperature can have a noticeable effect on the performance

of precision electronic equipment. For example, both solid-state devices

and precision resistors are susceptible to temperature changes. To

investigate the temperature stability of the source, the unit was placed

in a temperature-controlled chamber and operated at five temperatures.

During the test, the air temperature in the chamber was monitored and

recorded. After each change in chamber temperature, one hour was allowed

to elapse for the source to reach the new temperature. Both ac and dc

output voltages were recorded as a function of temperature from approximately

0° through +40°C. Figure 8 shows the limits of the change in output of the

dc source over this temperature range. Over the 0° to 40°C temperature

16
range, the maximum change in dc output voltage for all voltages measured

was 180 ppm. Since the source was not subjected to more than a 5°C departure

from the nominal 23°C reference temperature during any field test, the

assigned uncertainty was conservatively estimated to be no greater than

40 ppm.

The ac temperature stability was measured in the same manner as the

dc temperature stability. Figure 9 shows the changes in ac output voltage

referenced to the output of the source at 23°C. The maximum change in

the ac output voltage over all voltages and frequency combinations measured

was 400 ppm over the temperature range of 0° to 40° C. The assigned

uncertainty for ac voltage was estimated to be no greater than 80 ppm over the 23 ±5°C temperature range encountered in the field tests.

4.2.5 Start-Up Characteristics of the Source

The start-up characteristics of the source were investigated to

determine the time required for its output to stabilize after turning on power. This information was necessary in order to allow sufficient

warm-up time during field tests. The 10 V ac, 1 kHz output of the source

was measured alternately with the output of a fixed 10 V ac, 1 kHz reference

source. The reference source and the voltmeter had been powered continually

for several days prior to the test at an ambient temperature of 22 ±1°C. This

temperature was also maintained during the test. Both the source under test

and the reference source were measured alternately, each 50.5 seconds for a period of 195 minutes (3.25 h). As the source heated during the warm-up period,

the ac voltage increased in a manner similar to that observed during the

temperature stability tests. Figure 10 shows the changes in output voltage of

both the source under test and the reference source during the 195-minute

time period. The graph is plotted such that the output of the source

under test was set equal to zero ppm change at the time that power was applied. After 100 minutes, the source output voltage increased

approximately 60 ppm and "tracked" the reference voltage. It should be

noted that the initial measured output of the reference source happened

to be below the average shown for the remainder of the plot. This

difference has no significance and was unrelated to the output of the

calibrator.

From the data shown in figure 10, it was determined that at least

90 minutes should be allowed for the temperature stabilization of the

source under laboratory ambient conditions.

4.2.6 Distortion of AC Signals

The distortion of an ac signal is a measure of signal impurity. It is usually expressed as the percentage of the amplitude of the undesired

components to the amplitude of the desired component, at the fundamental

frequency of the signal. The total harmonic distortion (THD) expresses

the ratio of total power in all significant harmonics to that of the

fundamental. The power of the signal is proportional to the square of

its voltage amplitude.

17
The distortion characteristics of the ac output voltage from the source were investigated using a commercial distortion analyzer. The analyzer

removes the fundamental of the signal to be analyzed and measures the

remainder. This resultant signal includes harmonic distortion and other

components from noise or hum. The expression THD + N is normally associated

with such measurements where THD refers to the total harmonic distortion

and N refers to noise. The ac signal from the source was analyzed at

eight frequencies and four voltage levels. The rms value of THD + N is

shown in figure 11. No filters were placed in the signal path in making

the measurements of the THD + N values. Thus, small amounts of residual

voltage at the 60 Hz power-line frequency, typically about 50 pV,

account for the increase in the THD + N values at the lower voltage levels.

These distortion measurements were performed to verify that the ac source complied with the manufacturer's specifications. However, since

true rms measurements were always used to determine the amplitude of the

ac signal from the source, the distortion of the signal did not contribute

to an inaccuracy of the amplitude measurements.

4.3 Characterization and Calibration of NBS Pulse Source

4.3.1 NBS Automated Pulse Measurement System (APMS)

4. 3. 1.1 APMS Description

The system used to calibrate the PULSE DURATION source is the NBS

Automatic Pulse Measurement System (APMS). A block diagram of this

system is shown in figure 12. It consists of a minicomputer interfaced

to a wideband (dc-18 GHz) sampling oscilloscope through a 14-bit A/D-D/A

converter unit. In addition, circuits have been added to the sampling

oscilloscope to allow asynchronous triggering of the sampler with respect

to the computer.

The sampling oscilloscope is interfaced to the minicomputer and

A/D-D/A unit in such a manner that it may operate either in a stand-alone

mode or under computer control. In the stand-alone mode the oscilloscope

has a frequency response of dc to 18 GHz, sweep speeds of 10 ps/cm to

5 us/cm, an input voltage range of ±1 V, and a sampling trigger rate

of up to 50 kHz. Under computer control the frequency response, sweep

speeds, and input voltage range remain unchanged, but the maximum trigger

rate is reduced to approximately 7 kHz due to the added time between

samples necessary for A/D and D/A conversion and program instruction

execution

The minicomputer system is comprised of a computer mainframe, a flexible disk mass storage unit, a storage CRT terminal, a hard copy unit,

and a paper tape reader and punch. The computer mainframe contains a 16-bit word length central processing unit (CPU), 64 K bytes of non-volatile

core memory, peripheral interfaces, and a hardware floating point processor.

18
The latter reduces lengthy calculation times, such as for the Fast Fourier

Transform (FFT), by a factor of 10 to 100. The flexible disk mass storage

unit contains two disk drives providing an additional 500 K bytes of on-line

memory for data and program storage. The storage CRT terminal, interfaced

through a modified teletype port, runs in excess of 100 K baud. It operates in both an alphanumeric and graphic mode allowing a wide variety

of information output formats. The hard-copy unit, either under manual

or program control, produces a standard page-size paper copy of whatever

is displayed on the terminal screen.

The system software, obtained from the computer manufacturer, is

both sophisticated and versatile. Briefly, this disk operating system

contains everything necessary for system operation with FORTRAN IV. The

compiler, assemblers, loaders, editors, and libraries are all contained on flexible disks, as is an extensive package of diagnostic programs. From

the user's or programmer's point of view, practically all programming,

including graphics, is done in FORTRAN. The one exception is that the

programs written to control the A/D-D/A unit must be written in assembly

language as FORTRAN-cal led subroutines.

Referring again to figure 12, the system operates in the following

manner. The D/A converter analog output is connected to the sampling

oscilloscope time axis circuitry through a custom interface built into

the oscilloscope. The analog voltage from the D/A converter controls the

time at which the next voltage sample will be taken. Thus, a 0 V D/A

converter output corresponds to a voltage sample appearing at the leftmost oscilloscope screen graticule line and a full-scale (5 V) D/A output

corresponds to a voltage sample appearing at the right-most screen graticule line. Effectively, then, the D/A circuit generates a computercontrolled oscilloscope sweep, normally (but not necessarily) from left

to right.

The A/D converter is connected, again, through the custom interface

to the voltage axis circuitry in the oscilloscope. As each voltage sample

is taken, the converter's function is to digitize the sample voltage

level and send it to the computer memory. With this scheme the oscilloscope

screen has in effect been replaced by a 2

14 - by 2

14 - point signal recording

grid.

The data acquisition programs, together with the digital logic

circuitry in the custom interface, are designed to allow asynchronous

triggering of the oscilloscope with respect to the computer clock. The

oscilloscope trigger circuit, under interface control, locks out incoming

signal trigger pulses until the A/D has converted the last sample, the

D/A has settled to the next time position, and the A/D has been rearmed,

in that order. At that time the next available trigger pulse causes a new sample to be taken. With this arrangement there is no need to

synchronize the pulse generator with the computer program timing.

At the maximum trigger rate of 7 kHz, 1024-point time domain waveforms

may be acquired and stored in memory in about 150 ms. In order to improve

the signal -to-noise ratio, however, it is desirable to additively average

19
a large number of waveforms (usually 10 to 1000). This signal averaging

may be done either digitally in the computer or by use of an analog

averaging circuit specially built into the oscilloscope. For additional

information concerning the APMS see [1,2].

4. 3. 1.2 APMS Time Axis Calibration and Traceability

In order to use the APMS to calibrate the portable PULSE DURATION

source, it was first necessary to calibrate the APMS time and voltage

axes. Immediately prior to each set of pulse measurements, the time

axis of the APMS was calibrated using a commercial time mark generator.

This time mark generator, in turn, was calibrated to within 1 part in

10 8 against the NBS (Boulder) 5 MHz national standard.

Referring again to figure 12, the time mark generator output was connected to the sampling head of the APMS such that a train of ten pulses

(one per cm) was displayed and vertically centered on the screen of the

APMS sampling oscilloscope. The sampling oscilloscope was then switched

from the stand-alone mode to the computer-controlled mode and a program

entitled TCAL was executed.

The TCAL program acquires an averaged 2048-point discrete signal

representation of the pulse train and estimates the time between each

positive slope or negative slope mid-screen crossing. A linear least

squares curve fit is employed in the neighborhood of the mid-screen

crossings to increase the resolution of the measurement. The time axis

calibration factors, one for each centimeter on the screen, are then

written to a disk file for use as correction factors in subsequent waveform

acquisition programs. The short term (one day) overall estimate of

uncertainty of these calibration factors is ±0.1 percent of the total

time window or ±1 percent of the nominal time per centimeter.

The TCL program utilizes three subroutines entitled S00, LINE and

MATMUL. S00 is the waveform acquisition program and is written in

assembly language. It is used to acquire the averaged 2048-point

discrete signal representation of the pulse train input to the APMS and

to store it as a floating point time series in the computer core memory

for subsequent FORTRAN mathematical operations. Subroutines LINE and

MATMUL, written in FORTRAN, are used together to perform the linear

least squares curve fit of the data in the neighborhood of the midpoint

crossings.

When TCAL is executed, an interactive dialogue takes place between

the operator and the APMS. The terminal listing of a typical such dialogue

is shown in figure 13. As indicated, the operator was asked to type into

the system five variables. The first of these was the time mark generator

output frequency, in this case 50 MHz. Next, the operator was asked for

time calibration factors between sequential midpoint crossings of positive

slope (type 1) or negative slope (type 0). Third, the operator was asked

^Numbers in brackets refer to the literature references listed at the end

of this report.

20
for the desired number of data acquisition sweeps to be generated to

facilitate instrument setup. This program feature allows the operator

to observe the actual data acquisition process under computer control

and to make any last minute vertical or triggering adjustments before

data is actually recorded. Next, the operator was queried as to the

desired number of sweep averages to be recorded. The response shown,

200, indicates that each of the 2048 points in the recorded final waveform

was the mean value of 200 actual samples taken at each time point. The

last operator response was to indicate the desired number of data points

in the neighborhood of each midpoint crossing through which the program

is to fit a minimum-square-error straight line.

The program then computes the time calibration factors between each

of the (straight line) midpoint crossings that it found in the time

window. It then prints to the terminal and writes a disk file of these

calibration factors, the applicable interval of each calibration factor,

and the average time scale factor for the entire time window. Complete

program execution time is approximately five minutes.

4. 3. 1.3 APMS Voltage Axis Calibration and Traceability

As with the time axis, the voltage axis of the APMS was calibrated

using an oscilloscope amplitude calibrator designed and built by NBS

for this purpose. This calibrator is essentially a stable, accurate dc

voltage source with a range of ±1 V and adjustable in 1 mV steps. In addition, the source output resistance is switch selectable to <0.1 ft,

50 ft orl Mft. Further information concerning this calibrator may be

found in [3].

The amplitude calibrator was calibrated against an NBS (Boulder)

10 V dc standard to within ±0.05 percent of the calibrator voltage

output setting. It was then used to calibrate the vertical axis of the

APMS prior to each set of source pulse measurements.

The program used to calibrate the APMS vertical axis is entitled VCAL.

With the amplitude calibrator connected to the sampling head of the

APMS, and with the sampling oscilloscope set to a free-running trigger

and computer-controlled mode, known dc voltage levels were sampled and

averaged to yield a set of vertical scale factors, one for each centimeter

of screen display. As with the time axis factors, these vertical deflection

calibration factors were then written to a disk file for subsequent use

as correction factors in the pulse waveform acquisition program. The

short term (one day) overall estimate of uncertainty of these calibration

factors is ±0.1 percent of the total (10 cm) voltage window or ±1 percent

of the nominal voltage per centimeter.

As with the TCAL case, when VCAL is executed an interactive operator/system

dialogue takes place, a typical example of which is shown in figure 14.

As shown, the operator was first asked to type in the nominal vertical

scale factor setting on the sampling oscilloscope (100 mV/cm) and the

desired number of sweep averages (50). The operator was then instructed

21
to set the amplitude calibrator output voltage (connected to the sampling

head input) to the minimum desired voltage window value and then to

position vertically the free-running horizontal sweep to lie on the

lowest horizontal graticule line. When signaled (type any key), the

system recorded 50 sweeps of 1024 points each and calculated the mean

value of the 50 x 1024 points to yield one vertical voltage number. The

operator was then instructed to increase the amplitude calibrator output

by 100 mV (1 cm of deflection) and the above process was repeated.

After nine such repetitions were completed, the computer calculated

the eight sequential first differences and scaled them to yield mV/cm

vertical calibration scale factors for each of the eight visible centimeters

of display on the oscilloscope screen. These values were then printed to

the terminal, along with the mean of the eight values, and also written

to a disk file for later use. Like TCAL, the complete program execution

time is approximately five minutes.

4.3.2 NBS Pulse Source Calibration

4. 3. 2.1 Calibration Procedure for the EQUATE DIU Interface

Once the APMS time and voltage axes were calibrated in a manner

consistent with NBS standards, it was used to calibrate the

NBS/commercial PULSE DURATION source. Since the pulse source was to be

used to test the ability of the EQUATE ATE station to measure the parameter

PULSE DURATION, it was necessary to calibrate the source, as nearly as possible, at a reference plane electrically and mechanically matched to

the EQUATE unit under test (UUT) reference plane. Because the EQUATE

station has two such planes, the direct interface unit (DIU) and the

programmable interface unit (PIU), it was deemed necessary to provide a set of calibrated PULSE DURATION waveforms for each of the two different

planes. This section is concerned with the calibration of the pulse

source for testing EQUATE through the DIU interface, while that for the

PIU interface is discussed in the next section.

The problem of providing a known pulse waveform in the nanosecond/microsecond

time range is primarily a problem of maintaining a known wideband impedance

match from the generator to the measurement plane. From the Fourier

transform it is known that electrical pulses with durations in the

nanosecond range will contain frequency components that extend into the

gigahertz range. For example, a "rule-of-thumb" equation often used to

relate pulse duration to pulse harmonic content is

0.35

T d

That is, the 3 dB cutoff frequency, f c0 , of the harmonic content of a pulse is about equal to one third of the inverse of the pulse duration,

id. As a consequence of the pulse time/frequency relationship, it

becomes clear that the transmission of fast pulses requires the use of

22
wideband electrical networks. If the intervening network between pulse

generator and measurement plane does not present a matched impedance for

all harmonic frequencies contained in the pulse, then the pulse waveshape

at the measurement plane will be distorted.

The pulse generator output impedance is 50 a and the EQUATE

station DIU is, in fact, a 50 ft BNC coaxial connector so the problem of

maintaining pulse waveshape fidelity at the DIU measurement plane was simply solved by using a 2 m length of 50 £2 RG-58C/U coaxial

transmission line as a wideband interconnection. For purposes of testing

the DIU, then, the pulse source was configured as the combination of the

commercial pulse generator with a 2 m section of RG-58C/U connected to

its pulse output port.

The EQUATE station is capable of measuring PULSE DURATION (often

termed "time interval" in the manufacturer's literature) in the range of

20 ns to 1 0 ys. To evaluate the performance of the station, the

pulse source was calibrated at nominal PULSE DURATIONS of 50 ns, 100 ns,

200 ns, 500 ns, and 1 ys.

Figure 15 is a block diagram of the equipment configuration used to

perform the pulse source calibration for both the DIU and PIU measurement

planes using the APMS. For the DIU case the output pulses from the time

synthesizer pulse source were connected to the APMS sampling head via

the 2 m coaxial cable and a Gaussian nine-pole low-pass filter (dashed line

connection in the block diagram). This filter, designed and built by

NBS, was inserted to smooth out the small perturbations in the output

pulse waveshape caused by excessively high frequency components. In

actuality, two such filters were used; one with a 5 ns nominal transition

duration was used to smooth the 50 and 100 ns output pulses, while one with a 50 ns nominal transition duration was used to filter the 200 ns,

500 ns, and 1 ys pulses.

For purposes of calibration, the pulse source was driven by another

pulse generator acting as a repetition rate clock. This external drive

was necessary in order to provide a variable-delay trigger to the APMS.

When used to test the EQUATE stations, this drive was unnecessary because

the EQUATE uses a random sampling scheme precluding the need for a sampling

pretrigger. In any event, the output pulse waveshape from the pulse source

was unaffected by the triggering mode.

With the equipment configuration of figure 15, then, and with the DIU

measurement plane defined as the BNC output of the Gaussian smoothing

filter, the APMS was used to measure and record the pulse source output

waveforms.

4. 3. 2. 2 Calibration Procedure for the EQUATE PIU Interface

Attempting to provide a known pulse waveform to the EQUATE PIU

measurement plane was somewhat more complicated. Physically, the PIU

measurement plane is a zero-insertion-force (ZIF) 650 pin connector

configured in such a way that signal pins and signal shield pins are

23
interspersed in a checkerboard pattern. Behind each signal and signal - shield pin pair are I/O buffering and terminating electronics such that

each pin pair can be switched-sel ected for use as a signal source port

or a signal measurement port.

To provide a known pulse waveform at this PIU plane, it was necessary

to connect the time synthesizer to the pulse filter and then connect the

filter output to a PIU mating connector and calibrate the pulse output

at that point. The filter-to-PIU mating connector interconnection was accomplished by modifying the individual PIU connector pins so that a BNC to twin lead custom adapter could be attached to any PIU connector

pin pair. In order to connect the other side of the PIU mating connector

to the APMS sampling head for calibration of the pulse waveform at the

PIU measurement plane, a special twin-lead-to-SMA 3 mm coaxial adapter

was constructed. Tests were then run to ensure that the twin-lead-to-SMA

adapter contributed negligible distortion to the PIU connector measurement

plane output pulse. These tests were necessary because this adapter was

on the calibration measurement side of the PIU connector measurement

plane (as opposed to the generator side) and would corrupt the calibration

if poorly matched to either the PIU connector or the APMS sampling head.

Referring again to figure 15, the PIU calibration configuration (solid

line) was the same as for the DIU except for the addition of the two

adapters and the PIU mating connector.

4. 3. 2. 3 Calibration Data Acquisition and Analyses

This section consists of four major topics. The first is a discussion

concerning the definition(s) of the parameter PULSE DURATION as well as a description of the methods used in this work. The second is a description

of the APMS system programs used to acquire and process the pulse source

output waveform data. The third topic is a presentation of the results

of tests conducted to evaluate the pulse distortion contributed by the

twin-lead-to-SMA adapter used for the PIU measurement plane calibration.

The fourth topic is a presentation of the calibration data along with an analysis of that data.

Attempting to define the parameters of an arbitrary pulse waveform

is neither a simple nor a trivial task. Standards on the subject do

exist, however [4-7], which go far towards resolving the many difficulties

typically encountered. Figure 16, taken from [6] is a pictorial description

of all of the parameters of a single pulse. As shown, there are eight

different time parameters and six amplitude parameters. For this work,

three of these parameters are of direct interest, namely, PULSE BASELINE,

PULSE TOPLINE, and PULSE DURATION. That is to say, once the PULSE BASELINE

(0 percent level) and PULSE TOPLINE (100 percent level) amplitudes of a pulse are known, the PULSE DURATION (time between mesial, or 50 percent

points) may be calculated.

The major problem that arises in the practical measurement of PULSE

DURATION is the definition and determination of the PULSE BASELINE and

PULSE TOPLINE amplitudes. Actual measured pulses seldom exhibit perfectly

flat baselines or toplines, so the person performing the measurement

24
usually is forced to choose, perhaps arbitrarily, a method or algorithm

for determining these two amplitudes. This arbitrariness often leads to

different operators choosing different methods and consequently arriving

at different estimates for the pulse parameters of the same pulse waveform.

Clearly, then, accurate pulse parameter estimates require the use of

techniques and definitions agreed upon by everyone performing these

measurements. Although still relatively unknown and unused by persons in

the electronic and measurement field, the pulse standards cited above

resolve many of these difficulties.

Of the four algorithms for determining PULSE BASELINE and PULSE

TOPLINE magnitudes defined in [5], two were chosen for use in this work.

The first is the PEAK MAGNITUDE algorithm which consists simply of choosing

the smallest and largest voltage values of the recorded waveform as the

PULSE BASELINE and PULSE TOPLINE, respectively. The second algorithm

chosen, the MODE OF DENSITY DISTRIBUTION, is a bit more complicated.

Figure 17 (reproduced from [5]) illustrates the technique. As may be seen in (a), the recorded pulse waveform voltage-time plane is superimposed

upon a grid of small An - At rectangles. Then, as shown in (b), a probability density histogram is constructed by counting the number of

An - At rectangles through which the waveform passes for each

incremental magnitude. An. The PULSE BASELINE and PULSE TOPLINE are then defined to be the lower and upper modes (or peaks) of this bimodal

histogram, respectively.

Two FORTRAN programs were used to perform pulse waveform acquisition

and analysis. The first is entitled GMEAS. This program is a generalized

APMS waveform acquisition program that causes the APMS sampling oscilloscope

to measure a 2

n -point (n an integer less than or equal to 11) sampled

data waveform and store it as a FORTRAN array in the APMS minicomputer

memory. This array is then corrected for scale factor errors by use of

the previously obtained vertical and horizontal calibration factor files

described in sections 4. 3. 1.2 and 4. 3. 1.3. Finally, this corrected

pulse waveform array is written to a flexible disk file for further

analysis by other programs.

GMEAS contains a number of run-time options and was designed to

execute interactively. A typical terminal dialog listing is shown in

figure 18. Referring to this listing the operator was first asked to

type in the desired number of points for the pulse waveform acquisition

(2048), the nominal voltage scale (100 mV/cm), and the nominal time scale

(20 ns/cm). Next, the operator was asked if vertical and horizontal

scale correction was desired. Since, in this case, the response was

"yes," the names of the vertical and horizontal calibration factor disk

files were requested. The next two questions allow the operator to

correct an anomaly in the APMS sampling oscilloscope. Often, the first

few points of an acquired waveform are incorrect due to serial correlation

of the samples upon sweep retrace. When this error occurs, the operator

is given the option of linearly correcting the values of these few points.

In this example, the first five points were all reset to the mean of the

values of points six through ten. The next question allows the operator

the option of recording the no-signal baseline prior to recording the

25
actual pulse waveform. Choosing this option accomplishes two things.

First, it establishes the zero volt level on the screen, and secondly,

by subtracting this recorded baseline, point-by-point, from the recorded

waveform, baseline nonlinearity errors are removed from the recorded

pulse waveform. Lastly, the operator is instructed to apply the pulse

generator signal to the APMS sampling head, and, when ready, type a "1"

to begin recording. Although not shown, the operator is then asked to

select a disk file name for the acquired waveform. The program then

writes the waveform data to disk along with the vertical and horizontal

scale factors and the number of points in the waveform. Total execution

time for this program is typically ten minutes.

The program used to analyze the pulse waveforms recorded with GMEAS,

entitled PWA2KA, calculates all of the relevant pulse parameters using

either the PEAK MAGNITUDE or the MODE OF DENSITY DISTRIBUTION definitions

for PULSE TOPLINE and PULSE BASELINE described previously. In addition,

it produces a graph on the CRT terminal screen of both the pulse waveform

and its associated occurrence density histogram.

Figure 19 is a typical listing of the operator/program dialog and

figures 20a and 20b are typical graphical/alphanumeric program outputs.

Figures 20a and 20b are representations of the same pulse waveform

data, the difference being that figure 20a was generated using the PEAK

MAGNITUDE definition for the 0 percent and 100 percent levels while

figure 20b was generated using the MODE OF DENSITY DISTRIBUTION definition.

In the COMMENTS line of these figures, the words MIN-MAX refer to the

PEAK MAGNITUDE definition and the word HISTOGRAM refers to the MODE OF

DENSITY DISTRIBUTION definition.

Referring to figure 19, the operator was first asked for the number

of waveforms to be analyzed (one) and the waveform data disk file name

(T100). The program then lists 13 variables/parameters. In order,

these are the number of data points found in the disk file (2048), the

total time window (200 ns), the time spacing between samples (97.655 ps),

the histogram limit (20), the value of the first data point (-2.375 mV),

the value of the last data point (0.645 mV), the minimum value of all the

data points (-4.133 mV), the maximum value of all the data points

(390.925 mV), the value of the 0 percent level using the HISTOGRAM

definition (-2.127 mV), the number of data points lying in the vertical

interval corresponding to -2.127 mV (201 points), the value of the

100 percent level using the same definition (389.845 mV), the number of

data points lying in this correspondi ng vertical interval (134 points),

and, finally, the magnitude of the vertical expressed in millivolts

(0.308639 mV) and in a percentage of the PULSE AMPLITUDE (0.078124 percent).

The program then asks the operator if the histogram data is acceptable

and, although not shown, then asks for the desired 0 percent and 100 percent

definitions. It should be noted that the number of digits (in the above

floating point numbers) are not all significant in terms of measurement

accuracy.

In figure 20a, the MIN-MAX definition for the 0 percent and 100 percent

levels was chosen, while in figure 20b the HISTOGRAM method was chosen.

It is evident that there are small differences in all of the pulse parameter

26
estimates In the two figures even though the pulse waveform data was the

same. It may be noted In particular that the MIN-MAX PULSE DURATION was

100.321 ns representing a difference as a percentage of nominal value of

approximately 0.01 percent. Consequently, it was concluded that this

pulse was a "well-behaved" pulse suitable for use as a PULSE DURATION

standard due to its relative insensitivity to the 0 percent and

100 percent level definitions used.

For purposes of evaluating the effects of the interface adapters

used for the EQUATE station PIU tests, a 20 ns pulse from the source

was used. Referring again to figure 15, it may be observed that the 3 mm SMA/twin lead adapter (closest to the sampling head) lies to the right of

the measurement reference plane. Thus, the SMA/twin lead adapter must

be considered part of the APMS measurement system, and it becomes necessary

to show that the SMA/twin lead adapter contributes negligible distortion

to the pulse waveform calibration measurements.

This step was accomplished by first calibrating the 20 ns pulse

with the source connected to the sampling head via only the 6-ft

length of R6-58C/U. Then, the calibration was repeated with the adapter

inserted and the difference in the mean value of the parameter PULSE

DURATION was observed. Figure 21 shows the recorded 20 ns pulse waveform

directly into the sampler and figure 22 shows this same waveform after

insertion of the adapter. It may be observed that there is no discernable

difference in the two waveform shapes. Also, the calculated mean value

of the measurements of the direct-to-sampler pulse waveform was 19.404 ns while that with the adapter inserted was 19.419 ns. This amounts to a difference of only 0.025 percent for the 20 ns pulse and, for the narrowest

pulse used in the EQUATE stations tests, 50 ns, this deviation is only

0.01 percent. Therefore, with no visible distortion and such a small

difference in PULSE DURATION, it was concluded that the effects of this

adapter could be safely neglected.

Such was not the case, however, for pulse waveforms calibrated

through the complete PIU test configuration. Figure 23 is a record

of an unfiltered 20 ns pulse waveform measured through the PIU calibration

configuration shown in figure 21. Comparison of this waveshape with

that of a similar pulse presented directly to the sampler shown in

figure 15 indicates an appreciable amount of distortion is caused by

the BNC/twin lead adapter and the PIU connectors. Also, the comparison

of mean PULSE DURATION gave values of 19.404 ns for the direct-to-sampler

waveform and 19.380 ns for the PIU channel waveform. This is a 0.1 percent

difference for the 20 ns pulse. Because the objective was to provide a known pulse waveform to the EQUATE station UUT measurement planes, this

error, along with the observed distortion, was felt to be sufficient to

require separate calibrations for each pulse source waveform, i.e., one

for the DIU channel and one for the PIU channel.

The pulse source was calibrated for the parameter PULSE DURATION at

nominal values of 50, 100, 200, 500, and 1000 ns for both DIU and PIU

measurements. The time and voltage axes of the APMS were calibrated

immediately prior to each pulse waveform measurement. Also, each waveform

acquisition and analysis was performed three times in succession so that

an estimated measurement standard deviation could be calculated and used

to analyze measurement repeatability.

27
Figures 24a and b through 35a and b are the graphical /alphanumeric

outputs from the pulse waveform analysis program, PWA2KA, for each of

the pulse waveform calibrations. The (a) figures are based on the MIN-MAX

definition for the 0 percent and 100 percent amplitude levels while the

(b) figures are based on the HISTOGRAM definition for those levels.

Those figures labeled "DIRECT TO SAMPLER" represent pulse waveforms

measured at the DIU reference plane, and those labeled "THRU ITT CONNECTOR"

represent those measured at the PIU reference plane.

Still referring to these waveform figures, the "+F" in the labels means that a Gaussian nine-pole filter was placed on the output of the

pulse source. For the 50 and 100 ns pulses the filter employed had a nominal TRANSITION DURATION of 5 ns while that used for the 200, 500,

and 1000 ns pulses had a nominal TRANSITION DURATION of 50 ns. The

single exception to this use of filters is shown in figures 32 and 33

which are labeled "+FF." These 500 ns pulses were specially filtered by use of the 5 ns nine-pole filter in series with a 140 MHz sharp cutoff

filter to produce pulse waveforms, as shown, with an appreciable amount

of overshoot, undershoot, and ringing. These particular pulse waveshapes

were created for purposes of testing the EQUATE station's ability to measure such distorted pulses accurately.

The pulse source was calibrated in April 1981 and again in

June/July 1981. Tables 2 through 7 are summaries of the calibration

data for each different nominal pulse duration (50, 100, 200, 500, special

500 ns, and 1000 ns.) Each table consists of 11 columns. Column 1 lists the date that the calibration was performed. Column 2, labeled

"CNX," lists the calibration configuration with "BNC" representing the

DIU configuration and "ITT," the PIU configuration. Column 3 lists the

definitions used to estimate the 0 percent and 100 percent levels with

"M-M" representing the MIN-MAX method and "HIST," the histogram method.

The next column is labeled "FILTER" and lists the TRANSITION DURATION of

the nine-pole filter used for that calibration. Columns 5 and 6 list the

measured PULSE DURATION (Td) and the estimated standard deviation o,

based on three complete measurements. Columns 7 and 8 list the PULSE

AMPLITUDE (V a ) and the associated estimated standard deviation a. Similarly, columns 9 and 10 list the measured PULSE BASELINE amplitude.

Lastly, column 11 lists the change in PULSE DURATION calibration values

between the April and June/July calibrations expressed as a percentage

of nominal value.

28
5. FIELD TESTS AND PERFORMANCE VERIFICATION OF ATE SYSTEMS

5.1 Field Test of the EQUATE System at the Army Depot, Tobyhanna, PA

5.1.1 Test Procedures Used From DC to 10 MHz

The first application of the source to an EQUATE system was at the

Tobyhanna Army Depot where two systems are used. Since both of these

systems were in daily use, the generation and verification of the NBS

test software and the taking of measurements was planned to be as least

disruptive as possible. Three measurement programs were written in

ATLAS to run on the EQUATE system to measure dc voltages, low frequency

ac voltages in the range of 50 Hz to 50 kHz, and high frequency ac voltages

in the frequency range of 60 kHz to 10 MHz. These programs were designated

as DCV, ACVL, and ACVH, respectively, and were written with the assistance

of Army programmers at Tobyhanna familiar with the EQUATE system. A

listing of these three programs is given in appendix A.

The basic test procedures used with the EQUATE system were as follows:

A preprogrammed tape of test voltages was prepared prior to the visit.

After the on-site equipment had been operating for at least eight hours,

the tape was loaded into the source. The voltage test signal from the source was applied to the programmable interface unit ( PIU ) connector

through an adapter designed to apply the voltage to selected pairs of

measurement pins. The pairs of measurement pins were randomly chosen to

emulate a UUT that might be connected to the EQUATE system. Since the

specifications for the EQUATE system made no reference to measurement

errors associated with measurement pin assignment, it was presumed that

various pin combinations would exhibit similar characteristics. In general, six pin-pairs were chosen for the measurements and, of these,

four pairs were remeasured to determine if measurement errors were associated with specific pairs.

The source was interconnected to the EQUATE system as shown in

figure 36. The software in all three ATLAS programs executed initial

statements that selected the PIU as the input to the EQUATE system,

stored the number associated with the pin-pairs to be measured (TPHI and

TPL0) , and stored the maximum number of voltage measurements to be made

at each pin-pair (MAXSTP). In both the ac and dc measurement programs,

as each voltage was applied to the EQUATE system, two voltage measurements

were made using the MEASURE statement. The first MEASURE command caused

a voltage measurement with the EQUATE system in the autoranging mode,

and stored the result in the variable, VMAX. The second MEASURE command

remeasured the same voltage (VDC or VAC), using the results of the first

measurement to specify the maximum voltage to be measured. Thus, the

proper range was found for making the actual voltage measurement that was printed and recorded on the EQUATE system disk file. In a similar

manner the ac programs also measured and recorded the frequency of the

input voltage and used that value as the maximum frequency for the final

voltage measurement. Those familiar with the EQUATE system at Tobyhanna

felt that this procedure was an effective way of assuring that the voltage

range would be selected which provided the best system resolution and

accuracy. At the end of the measurement cycle, a 5 V "test complete"

29
pulse was sent from a designated set of pins on the PIU (127 and 128) to

the source in order to signal the end of the voltage measurement. The source responded to this signal by providing the next voltage in the

preprogrammed sequence. After a three-second delay, the next set of

measurements was initiated, and the process continued until the required

number of measurements was made. At this point, the operator intervened

to either select another set of PIU pins or to terminate the program.

Part of the experimental design of the field test included the choice

of voltage sequences that would be measured by the EQUATE systems. It was decided that the test voltages to be measured should be a random

sequence of amplitudes and frequencies in order to emulate the testing of

a UUT whose output could assume a wide range of values. As originally

designed, the voltage sequence covered the range of ±0.1 V dc through

±200 V dc and from 0.1 V ac (rms) through a maximum of 140 V ac (400 V ac peak-to-peak). This range was chosen to be within the

specifications of the EQUATE system measurement capability. The final

sequence used in the tests is given in tables 8A and 8B.

Although a randomized measurement sequence was desirable from the

theoretical point of view, this procedure was difficult to implement in

the first field tests. The relatively short time that was available in

which to write and debug the ATLAS field test software, interface the

calibrator to the EQUATE system, and take final measurements on an unfamiliar system were extenuating factors. Three problems were thus

presented with attempting this randomized approach. First, it was found

on initial testing that the EQUATE sytem would sometimes interpret a voltage to be slightly higher than the maximum of ±200 V dc, or 140 V ac,

simply due to measurement errors. This effect would cause the system to

abort the ATLAS program and return to the Command Language Interpreter

(CLI) mode of operation. At that point, partial files would have to be

closed and deleted, and the program restarted. In addition, there

was some concern about the advisability of applying voltages to the

input of the EQUATE system that approached its specified limits since

failures in input components had been known to result from this practice.

The source program tape was modified therefore to remove the three

+200 V dc and the three -200 V dc commands. However, in order to obtain

some data near the operating limits of the EQUATE system, one +195 and

one -195 V dc command were included at the end of the test sequence. The ac tape was also edited to remove the five measurements at 1 40 V ac. Additionally, it was found during the execution of the ACVL program that

the low input impedance of the PIU caused the rated current capability

of the source (6 mA) to be exceeded at 70 V ac and 20 kHz. This data

point was also removed from the program tape.

A second problem occurred because of two errors in programming the

data on the dc and low frequency ac tapes. Both the +0.1 and -0.1 V dc

data points were to be replicated three times. An error in randomizing

the data caused the +0.1 point to be replicated twice, while the -0.1 V dc

point was repeated four times. In addition, the 0.7 V ac, 100 Hz data

point was repeated inadvertently in the low frequency sequence.

30
The third problem encountered was in obtaining the high frequency ac data. To appreciate this problem, It is necessary to understand the

voltage measurement system internal to the EQUATE system. The measurement

system consists of two sampling units: the low-speed voltage sampling

unit (LSVSU) and the high-speed voltage sampling unit (HSVSU). To

measure dc or ac voltages below 50 kHz, the LSVSU must be used. Above

50 kHz, the HSVSU is required. The input to the LSVSU is normally a pinpair or differential type connection, while the input to the HSVSU is a single pin and ground (single ended) connection. In order to measure an

ac voltage that varies over a wide frequency range, as originally planned

for the high frequency, wide-band output of the calibrator, a change in

the connections would have to be accomplished. In addition, the wideband output of the calibrator must be terminated into a 50 ft load for

its amplitude to be correct. The EQUATE system software manual gives the

operator the choice of making either "buffered" or "unbuffered" measurements

while using the HSVSU. Furthermore, two notes in the programming manual

state that (1) the "TEST-EQUIP-IMP" of 50 n is available only above

50 kHz, and (2) that the user is not to use the TEST-EQUIP-IMP field

of an ATLAS statement with a buffered measurement or with the RF-probe.

On this basis it was decided to make the measurements in the unbuffered

mode using the internal 50 a load. We were also told that this procedure

would exercise the measurement capability of the EQUATE system as it is

commonly used in testing UUTs. However, applying high frequency signals

directly to the analog bus, without using a buffer amplifier, resulted

in excessive loading of the calibrator. As a result, the voltages measured

at the Army Depot were excessively low and out of tolerence. Hence,

information was not obtained on the accuracy of a properly buffered and

terminated measurement channel in the frequency range of 60 kHz to 10 MHz.

5.1.2 Test Procedure Used With Pulse Source

Along with the dc and low frequency tests described above, one of

the EQUATE systems (serial #5) was tested for its ability to measure the

parameter PULSE DURATION over a range of 50 to 1000 ns. Briefly, this was accomplished by programming the EQUATE station to measure the PULSE

DURATION parameter of a variety of pulses generated by the NBS calibrated

pulse source described in chapter 4.

The EQUATE system hardware is made up of a minicomputer system

with peripherals, signal stimulus electronics, signal measurement

electronics, and all necessary switching and connector components. The

system may be used in either the direct interface unit mode (DIU) or programmable interface unit mode (PIU). Pulse measurement tests were conducted in both modes; the main differences between the modes from the

operator's viewpoint are involved with the different measurement port

connectors required. The PIU measurement port is a multipin zero-insertionforce (ZIF) connector with 128 signal pins that may be programmed to be

either signal source pins or signal measurement pins. In addition, there

are 128 signal pins which are programmable only as signal measurement

pins. The DIU measurement port for pulse parameter measurements consists

of six BNC connectors.

31
According to the EQUATE system specifications [8], the parameter

PULSE DURATION may be measured over a range of from 20 ns to 60 s (50 ns minimum detectable pulse). The pulse threshold amplitude range is from

±50 mV to ±200 V peak. The accuracy specification is

±(5 ns + trigger error) where the trigger error is defined as

_3

TP + 3.2 x 10 sensitivity

*

* N signal amplitude *

where N = number of cycles of input signal over which the measurement took

place. Also pertinent is the system specification that the PIU may be

used for signal frequencies from dc to 10 MHz, and the DIU for signal

frequencies from dc to 500 MHz [9].

The NBS pulse source was used to test the EQUATE station's ability

to measure PULSE DURATION through both the PIU and DIU measurement ports.

For each of these ports, pulse source pulses with a nominal PULSE AMPLITUDE

of 400 mV and a pulse repetition rate of 200 KHz were used. As mentioned

in chapter 4, nominal PULSE DURATIONS of 50, 100, 200, 500, and 1000 ns were generated by the pulse source for measurement by the EQUATE station

through the calibrated UUT output interfaces for both the PIU and DIU

connectors.

On the EQUATE system, the measurement of the parameter PULSE DURATION

is a three-step process. First the value of the 100 percent voltage

level of the pulse is measured ( VOLTAGE-P-MAX) . Then, the value of the

0 percent voltage level is measured (V0LTAGE-P-MIN). Finally, a time

interval measurement is conducted between the computed 50 percent level

positive slope portion of the pulse and the computed 50 percent level

negative slope portion. This latter measurement yields the value of the

PULSE DURATION.

At the Army Depot, in the interest of saving time, existing EQUATE

ATLAS programs written previously by site personnel were modified and

used for these tests. Although the complete source text of these programs

is too lengthy to reproduce in this report, the three key ATLAS instructions

used to perform these tests are reproduced and described below.

For the PIU tests the first ATLAS instruction was:

MONITOR (VOLTAGE-P-MAX 'VMAX' V),

PULSED-DC, V0LTAGE-P MAX ' VM' V,

PERIOD ' P' USEC, DUTY-CYCLE 'DC' PC,

TEST-EQUIP-IMP 50 OHM, CNX HI ' MHITP ' $.

This instruction causes the value of the 100 percent voltage level of

the pulse applied to the PIU test point 'MHITP' to be measured, recorded

into memory, and displayed on the monitor screen. The instruction contains

four input variable arguments and one output variable argument. The

four input variables are the expected value of the maximum pulse amplitude,

'VM,' the pulse repetition period, ' P

,

' the percent pulse duty cycle,

'PC,' and the PIU test pin to which the pulse is applied, 'MHITP.' The

output variable, 'VMAX,' contains the measurement answer upon execution

of the program statement.

32
As discerned from the manufacturer's EQUATE programming manual, the

ATLAS compiler causes the pulse 100 percent voltage level measurement to

be accomplished in the following manner. First, the pin number selected

by the variable ' MHI TP ' causes the necessary switching to connect that

PIU pin to the measurement bus and to either a low-speed or a high-speed

voltage sampler. The value that is input to the period variable, ' P

,

determines which sampler is selected; if the period is less than 10 kHz

the low-speed sampler is selected, and if the period is greater than

10 kHz the high-speed sampler is connected to the measurement bus. The

amplitude input variable, ' VM, ' causes an appropriate amount of gain or attenuation to be switched into the measurement channel to ensure that a suitable pulse signal level is seen by the sampler. The remaining input

variable, 'PC,' the pulse duty cycle, or percent of time that the pulse

is on with respect to the pulse repetition period determines the number

of voltage sample measurements taken by the sampler.

Once all of the bus switching, gain setting, etc., has taken place,

the sampler is instructed to sample the pulse waveform, randomly in time,

between 1000 and 100,000 times depending on the duty cycle variable,

'PC.' Smaller values of pulse duty cycle cause more samples to be taken.

Of these thousands of voltage samples taken, the 65 samples of largest

voltage level are retained in memory. Of these 65, the smallest ten

values are averaged and this mean value is the answer returned to the

variable ' VMAX ' and displayed on the monitor screen as the pulse voltage

peak maximum or 100 percent voltage level.

The ATLAS instruction used next to determine the pulse voltage

baseline, or 0 percent voltage level was:

MONITOR ( VOLTAGE-P-MIN 'V'), PULSED-DC,

V0LTA6E-P MIN 'VMIN' V, PERIOD 'P' USEC,

DUTY-CYCLE 'DC' PC, TEST-EQUIP-IMP 50 OHM,

CNX HI ' MHI TP 1 $.

This instruction is almost identical to the V0LTAGE-P-MAX instruction

and causes the hardware to behave in exactly the same manner.' The only

difference is in the behavior of the random sampling algorithm. In this

case the 65 samples of smallest voltage level are retained in memory, and

of these 65, the 1 argest ten values are averaged. This mean value is

then returned to the variable 'VMIN' and displayed on the screen.

Once the values of the pulse 100 percent and 0 percent voltage

levels have been measured and recorded, the ATLAS program instructs the

computer to calculate the 50 percent voltage level, i.e., ('VMAX' + ' VM IN' ) / 2

This 50 percent level is then recorded into the variable 'THRESHOLD' for use in the time interval measurement instruction. This third key

instruction, which actually measures the pulse parameter PULSE DURATION,

is written in ATLAS as:

33
MONITOR (TIME 'PDPN' USEC), TIME-INTERVAL,

SINGLE-CHANNEL, MAX-TIME 1 SEC, START,

VOLTAGE-P MAX 'VMAX' V, THRESHOLD 'THRESHOLD' V,

POS-SLOPE, TEST-EQUIP-IMP 50 OHM, CNX

HI ' MHI TP ' , STOP, THRESHOLD 'THRESHOLD' V,

NEG-SLOPE$.

Again, as discerned from the manufacturer's EQUATE programming

manual, the execution of this instruction causes the signal present at

PIU test point ' MHI TP ' to be routed via the measurement bus to an integral

high-speed timer/counter called the frequency sampling unit (FSU). The

arguments of this instruction tell the FSU to begin counting a 500 MHz

internal clock when the incoming signal exceeds the voltage value contained

in the variable 'THRESHOLD' with a positive slope and to stop counting

the clock when the signal voltage drops down below 'THRESHOLD' volts with

a negative slope. The amount of elapsed time measured by the counter is

recorded as the PULSE DURATION into the variable 'PDPN' and is displayed

on the monitor screen. It should be noted that the use of a 500 MHz

clock in this measurement technique limits the PULSE DURATION measurement

resolution to 2 ns (500 MHz) -1

.

For all of the EQUATE PIU measurements, the low side of the NBS pulse source was connected to a different PIU signal pin and grounded within

the EQUATE system with the ATLAS instruction:

CONNECT EARTH, CNX TP ' MLOTP ' $

.

This method of grounding is only used in the PIU unbuffered mode.

The pulse tests were also conducted through the EQUATE DIU UUT

measurement port. The three key ATLAS instructions used to perform these

measurements are:

MONITOR (VOLTAGE-P-MAX 'VMAX' V), PULSED-DC,

VOLTAGE-P MAX ' VM' V, PERIOD ' P

' USEC,

DUTY-CYCLE 'DC' PC, TEST-EQUIP-IMP 50 OHM,

CNX BNC ' MHI TP ' $,

MONITOR ( VOLTAGE-P-MIN 'V'), PULSED-DC,

VOLTAGE-P MIN ' VMIN* V, PERIOD ' P' USEC,

DUTY-CYCLE 'DC' PC, TEST-EQUIP-IMP 50 OHM,

CNX BNC ' MHI TP ' $,

and

MONITOR (TIME 'PDPN" USEC), TIME-INTERVAL,

SINGLE-CHANNEL, MAX-TIME 1 SEC, START,

VOLTAGE-P MAX 'VMAX' V, THRESHOLD 'THRESHOLD' V,

POS-SLOPE, TEST-EQUIP-IMP 50 OHM, CNX BNC

'MHI TP', STOP, THRESHOLD 'THRESHOLD' V,

NEG-SL0PE$.

With the exception of the change in measurement ports from the PIU ZIF

connector to the DIU BNC connector, these instructions are virtually

identical to those used for the PIU tests.

34
Although not Included in the project work statement, an attempt was made to program the EQUATE station to measure the parameter PULSE TRANSITION

DURATION (10 to 90 percent). This was accomplished by instructing the

computer to calculate the 10 percent and 90 percent voltage levels of

the measured pulse and placing these values into the variables "TEN" and

"NINE," respectively. Then, the following ATLAS time interval measurement

instruction was executed:

MONITOR (TIME ' TR ' USEC) TIME-INTERVAL,

SINGLE-CHANNEL, MAX-TIME 1 SEC, START,

VOLTAGE-P MAX ' VMAX* V, THRESHOLD 'TEN' V,

POS-SLOPE, TEST-EQUIP-IMP 50 OHM, CNX HI

' MHITP' , STOP, THRESHOLD 'NINE* V, P0S-SL0PE$.

This instruction should have measured the 10 to 90 percent first PULSE

TRANSITION DURATION parameter and returned its value to the variable

'TR.' However, for reasons still undetermined, the system returned the

message "NO MEASUREMENT COMPLETE" to the system terminal for all attempted

measurements.

5.2 Test Data Collection and Analysis, Army

5.2.1 DC Signals

During each field test, the measurement data were printed on a hard copy printout on the system line printer as well as written into a disk file. The data on the disk file were then transferred to a magnetic

tape via the CLI XFER command. In this manner the measurements were

stored in machine-readable form for later data analysis. Additionally,

hard copy and magnetic tape outputs were made of the ATLAS programs that were used to acquire the data. At NBS the magnetic tape was read, and

the data on the tape were checked against the hard copy output from the

EQUATE station. Since the tape formats of the NBS computer are slightly

different than those written by the EQUATE station, some data editing

was necessary. The recorded measurements were then compared to the

preprogrammed values that were applied from the calibrator and the

deviations were calculated. The dc measurements consisted of 440 data

points, representing 44 voltages presented to each of the six PIU pinpairs with four pin-pairs replicated. A sample printout of the data

after the aforementioned reduction is shown in table 9.

The distribution of the number of data points within a given tolerance

band is shown in the histogram, figure 37. It should be appreciated

that the data shown in this figure are a summary description of the

population of measurements made on this EQUATE station for all dc voltages

at all pin-pairs. The distribution of errors as a function of applied

voltage may be seen in the next two figures. Figure 38 shows the

deviation from nominal, as a function of voltage, over the entire voltage

range investigated, -195 to +195 V dc. It is clear that most of the

deviations from nominal occur near zero volts. Figure 39 shows an expansion of the scale of figure 38 from -5 V dc to +5 V dc. Notice that

at progressively lower voltages, the negative voltages tend to have

negative deviations and the positive voltages tend to have positive

deviations.

35
Using the acquired data, the pin-to-pin (or channel -to-channel

)

reproducibility may also be analyzed. Since, in general, a given set of

pins were tested at a given voltage level three times, the reproducibility

of the measurements may be plotted as shown in figures 40a to 40c.

Figure 40a shows the set of measurements made at +100 V dc at the six

pin-pairs along with the four replications. The pin-to-pin reproducibility

of measurements is not necessarily simply grouped by pin set as implied

in the data of figures 40a through 40c. A similar plot of the pin-to-pin

reproducibility for -100 V dc shows that 5 out of 30 measurements have a positive error, while the remaining 25 have a negative error from 0.075

to 0.10 percent. When -5 V dc was applied to the EQUATE system, the pin-topin reproduci bi 1 ity at pin set number 3 (correspondi ng to pin numbers

71 and 72) yielded an outlying set of measurements. The pin-to-pin

reproducibility for applied voltages of -100 and -5 V dc are shown in the

plots 40b and 40c, respectively.

From the preceding plots, it is construed that this pin-pair (71-72)

might be one of the more consistent of those investigated. One possible

cause of the lack of pin-to-pin reproducibility could be variations in

the contact resistance of relays in the PIU network. It is well known

that relay contacts which are switched "dry," or at very low contact

current are susceptible to large contact resistance variations. No

effort was made to actually verify that this was actually the case, however.

5.2.2 AC Signals to 50 kHz

The ac data taken on the Army EQUATE system represents 464 measurements

made at six pin-pairs with two pin-pairs replicated. A sample printout of

the ac data after reduction is shown in table 10. The applied voltages

covered the range of 0.3 to 70 V ac and frequencies from 50 Hz to 50 kHz.

One data point, at observation number 390, was in error; the EQUATE

system measured an approximate 60 mV ac signal when a 70 V ac, 100 Hz signal was applied. It is apparent that this data point is grossly in error and represents a test malfunction rather than a timely measurement

error. One criterion simply used to distinguish machine malfunctions

from measurement errors is to determine if a skilled operator of the

measurement system would be misled by such outlying data. In our estimation,

a skilled operator would be suspicious of this point, justifying its

exclusion from further data analysis.

The same data is shown as a histogram in figure 41. It is evident from

the bimodal distribution that some process caused an abrupt change in the

deviations. Plotting the deviations against the applied voltage, as shown

in figure 42, shows the cause for the bimodal distribution. Of the 463 ac voltage measurements acquired, 248 were within the voltage range of 0.3 to

3.0 V ac. Of these 248 measurements, 244 were within a tolerance of

±1 percent. However, between 7 and 70 V ac, 215 measurements were acquired and 181 were within the range of -1 to -3 percent. Thus, there

appears to be a systematic error that affected the voltage measurements

within the 7 to 70 V ac range. This result is typical of what would be

expected from a multi -range voltmeter that had an error in its range

attenuators. Those points scattered around the two major clusters of

data points in figure 42 all represent measurements at a frequency of

36
50 kHz. This observation is clearly seen if the deviation from nominal

is plotted against frequency, as shown In figure 43. In addition to the

bimodal distribution of the voltage distribution, it is also seen that

the greatest spread in errors is at the highest frequency. It Is suspected

that errors that are as strongly dependent on frequency as exhibited in

this figure are caused by an effect of the sampling process that is used

in the EQUATE system to measure ac voltages.

5.2.3 Pulses

The NBS pulse source was used to test the Tobyhanna EQUATE station

(serial #5) on three different PIU pin-pairs ( HI -PI N 1, LO-PIN 11,

HI -PIN 44, LO-PIN 28 and HI-PIN 120, LO-PIN 92) and three different DIU

BNC connectors (numbers 1, 2, and 4). For each of these measurement

port pins/connectors the EQUATE station was instructed to make five

complete sequential PULSE DURATION measurements on each of the nominal

pulse source calibrated pulses, i.e., 50, 100, 200, 500, 500 (sharp-cutoff

filter), and 1000 ns. As previously mentioned, the nominal pulse source

pulse amplitudes were 400 mV and the nominal pulse repetition frequency

was 200 kHz in all cases.

The EQUATE measured data is summarized in tables 11 through 16.

Each table represents the measurement results for all pulses measured on

a particular PIU pin or DIU connector. Each table is arranged in the

following manner: Column 1, labeled "NBS Pulse Duration" lists the NBS

calibration value (MIN-MAX definition) for each of the six different

pulses tested. Column 2, labeled "t[|," lists the five sequential

measured values obtained from the EQUATE station for the pulse parameter

obtained PULSE DURATION for each of the six different pulses. Column 3,

labeled "tq" lists the mean value of each of the sets of five values

in column 2, and column 4, labeled "a," lists the standard deviation

of each of those sets. Columns 5, 6, and 7 list the five individual voltage

peak maxima (100 percent voltage level) recorded for each measurement

along with their means and standard deviations, respectively, while

columns 8, 9, and 10 contain the same corresponding measurement data

for the voltage peak minima (0 percent voltage level). Column 11, labeled

"At (ns)," lists the difference between the NBS pulse source calibrated

values for PULSE DURATION of column 1 and the EQUATE measured mean value

of column 3 in ns. These data are in the column 11 rows labeled "MEAN."

Column 11 also lists the difference between the pulse source calibrated

value and the worst individual EQUATE measured value (largest absolute

difference). These data are labeled "WC," or worst case. Column 12

contains the same information listed in column 11, but the deviations are listed as a percentage deviation from nominal rather than in ns.

A number of observations may be drawn from these data. First, the

EQUATE measurements of PULSE DURATION vary considerably, with deviations

from nominal ranging from -16.1 percent to less than 1 percent. Generally,

the larger errors occur for measurement of faster pulses. Also, particularly

in the case of the PIU measurements, the measured values of voltage peak

maxima (column 5) deviate considerably from the nominal value of 400 mV.

In addition, these values appear to increase monotonical ly with nominal

pulse duration.

37
5.3 Field Test of the EQUATE System at the

Naval Avionics Center, Indianapolis, IN

5.3.1 Test Procedure Used From DC to 10 MHz

The second application of the source to an EQUATE system was at the

Naval Avionics Facility. Prior to our visit to the Naval Avionics Facility,

the ATLAS programs that were used at Tobyhanna Army Depot were sent to

the Naval Avionics Facility for inspection and comment. Some modifications

were made to ensure software compatibility to the Navy EQUATE system. In

general, the same basic procedure was used at the Naval Avionics Facility

as was used at Tobyhanna Army Depot. The three programs used to measure

dc voltage and low- and high-frequency ac voltages were reentered at the

Navy site since the program tape prepared at Tobyhanna Army Depot could

not be read directly on the Navy EQUATE system. The ATLAS programs used

at the Naval Avionics Facility are listed in appendix B. It was planned

to interconnect the source in the same manner as was previously done at

Tobyhanna Army Depot. However, immediately before our visit, it was learned that the front-panel connectors on the Navy EQUATE system differed

from those used by the Army at Tobyhanna Army Depot. The cable from the

calibrator was connected to the PIU in this case by a transition fixture

provided by the Naval Avionics Facility for this purpose. The fixture

consisted of an array of banana jacks mounted on the rear of a multipin

connector which mated with the PIU.

Several minor modifications were made to the sequence of voltages

that were applied to the Navy EQUATE system. The highest dc voltage

applied was ±195 V, and this voltage was replaced in the original

sequence such that both the positive and negative voltage appears three

times.

During the test of the EQUATE system at the Naval Avionics Facility,

the system placed excessive loading on the calibrator at the 70 V ac and

20 kHz point. Thi s overloading was the same problem encountered previously

at Tobyhanna Army Depot, and the action taken was also the same, namely,

to remove this data point from the sequence. The final sequence of ac and dc voltages applied to the EQUATE system is shown in table 17.

The particular EQUATE system at the Naval Avionics Facility used a computing counter to acquire the frequency of the ac signal to be measured.

Two difficulties were encountered with this unit. First, the counter

could not properly acquire a frequency when the voltage range of the

counter was set on the 300 V ac scale. This scale was used to measure the

frequencies of all 130 V ac signals. Secondly, the trigger level of the

counter exhibited a hysteresis of approximately 100 mV. Thi s phenomenon

resulted in erratic frequency measurements for signals at or below this

voltage level

5.3.2 Test Procedure Used With Pulse Source

The NBS pulse source pulses measured on the NAC EQUATE station were

the same as those tested at Tobyhanna with the single exception that

their nominal amplitudes were increased from 400 mV to 2.50 V. This

38
f

1

proved to be necessary due to the fact that the timer/counter In the NAC

EQUATE was not the same model as that in the Tobyhanna EQUATE and had

different signal sensitivity requirements.

Also, the tests were expanded and modified somewhat, partially on the advice of NAC site personnel. In particular, the parameter PULSE

DURATION was measured through the PIU both with and without an internal

buffer amplifier connected into the measurement channel. Pulse TRANSITION

DURATION (10 to 90 percent) measurements were also attempted at NAC with

generally poor results, and no results were obtained in an attempt to use the

EQUATE in a waveform recorder mode. Lastly, some time domain reflectometry

(TDR) tests were conducted on the PIU and DIU measurement ports to aid

in evaluating the measurement port impedances.

The PULSE DURATION measurements conducted on the Naval Avionics

Facility EQUATE system were similar to those conducted on the Tobyhanna

system. However, there were some differences which are listed below.

(a) The PIU multipin ZIF connector on the NAC EQUATE was physically

different enough to preclude using the NBS interface adapter

described in chapter 4. Therefore, the 3 mm SMA/twin lead

adapter, also described in chapter 4, was used to interconnect

the NBS pulse source and the PIU.

(b) At Tobyhanna, the NBS pulse source high and low terminals were

each connected to PIU signal pins, i.e., Hl-Pin #1, LO-PIN #11.

The low pin was then grounded in the PIU with the ATLAS CONNECT

EARTH instruction. At Indianapolis, the NBS pulse source high

and low terminals were connected to a single signal pin and its

shield pin, respectively, i.e., HI - PI N #1, LO-PIN #1S.

(c) PIU measurements of PULSE DURATION at Tobyhanna were performed

only in the unbuffered mode while both buffered and unbuffered

PIU measurements were performed at Indianapolis.

(d) The NBS pulse source nominal pulse amplitude used at Tobyhanna was

400 mV while that used at Indianapolis was 2.50 V. As mentioned,

changing the amplitude was necessary to meet the sensitivity

requirements of the two different timer/counters. This change did

not affect the calibration of the NBS pulse source.

New ATLAS programs were written at Indianapolis to perform the pulse

measurements. The ATLAS source program listing for the PIU pulse

measurement is shown in appendix C. The only salient difference not

already mentioned between the Tobyhanna ATLAS instructions and those used

at Indianapolis is the replacement of the unit USEC with the unit NSEC in

the time interval measurement instruction. A typical measurement output

listing is shown in appendix D.

The program used to perform the DIU pulse measurements is shown in

appendix E and a typical measurement output listing is given in appendix F. There was only one DIU BNC measurement connector on the Indianapolis

EQUATE, as opposed to six on the Tobyhanna EQUATE, so only one measurement

was conducted.

39
5.4 Test Data Collection and Analysis, Navy

5.4.1 DC Signals

Since the manner in which the data were acquired at the Naval

Avionics Facility was similar to that described in the previous section,

the presentation of the data is also similar. There were 480 dc voltage

measurements taken on the EQUATE system at the Naval Avionics Facility.

The 480 measurements represent a sequence of 48 voltages that were applied

to each of six pin-pairs with four pin-pairs replicated. A typical

printout of the data, after reduction, is shown in table 18. These data

show that 60 of the 480 dc voltage measurements were in error by more

than 50 percent. These errors seem to have two origins. The first and

most obvious are sign reversal errors that occurred each time +100 V dc was applied to the system. Notice that since the system measured -100 V dc,

a sign-reversal error causes a -200 percent error on the plot. The

second source of error was a more random type which caused +1 0 V dc

inputs to give erratic readings. The distribution of all dc observations

is shown in figure 44, and the two types of errors may be clearly seen as distinct groupings in the distribution. The errors associated with the

sign reversals are located at -200 percent, and those associated with the erroneous +1 0 V dc readings are grouped between -100 and -175 percent.

The presence of these large errors was detected at NBS during the reduction

of the data. Attempts were made to replicate a condition whereby the

calibrator may have malfunctioned. The tape cassette used to program

the calibrator was used in another calibrator to assure that it contained

the expected data. The sign reversal errors could not be duplicated in

the laboratory. It was later learned that the subject EQUATE system

contained a defective analog-to-digital converter which malfunctioned

only near full scale of the conversion range.

If the 60 data points that are in error by more than 50 percent are removed from further analysis, most of the errors are within a 2 percent

band from +0.5 to -1.5 percent. The distribution of these points is

shown in the histogram of figure 45. Figure 46 shows the percent error

as a function of applied voltage over a range of -195 to +195 V dc. It is apparent that most of the deviations from nominal occurred near zero

volts, similar to previously observed results on the EQUATE system at

Tobyhanna Army Depot. Figure 47 shows the deviation from nominal over a voltage range of -5 to +5 V dc.

The ability of the EQUATE system to measure the same voltage at

different PIU pin-pairs was investigated in the same manner as before.

The pin-to-pin reproducibility for three dc voltage levels is shown in

figures 48 through 50. Although there are slight deviations from nominal

value at -100 V dc (approximately 0.6 percent), the ability of the system to measure the same voltage at various pin-pairs is quite uniform. Each

plot in figures 48 through 50 represents data taken on each of six

pin-pairs with replications of four pin-pairs.

40
5.4.2 AC Signals to 10 MHz

The performance of the Navy EQUATE system to acquire ac voltages was performed in nearly an identical manner as was performed with the Army

system. A sequence of 448 ac observations was made between 50 Hz and

50 kHz and voltages 0.3 to 1 30 V ac. These voltages were applied to

each of five pin-pairs on the DIU, and the measurements of two pin-pairs

was replicated. The gross errors occurred at the seven data points

corresponding to 7 V ac and 50 kHz. Since these points read consistently

in error by more than 50 percent, they have been removed from further

analysis. The distribution of these observations is shown in the

histogram of figure 51. Notice that all the data points are within

a ±1 percent tolerence except for some additional measurements made at

50 kHz. Figures 52 and 53 show the deviations from nominal plotted

versus applied voltage and frequency, respectively. Figure 52, unlike

figure 42, does not show a range error at 7 V ac. However, figure 53

does show that the errors are predominantly located at the 20 and 50 kHz

measurements. This result is consistent with the observations shown in

figure 43. A typical printout of the data, after reduction, is shown in

table 1 9.

The ability of the EQUATE system to measure ac voltages between

0.6 and 10 MHz was also investigated on the Navy's EQUATE system. Since

time was short, measurements were made at one input pin and one voltage

to the DIU. To increase confidence in our measurements, the voltage

applied to the EQUATE system was monitored by a 31/2 digit wide-band

digital voltmeter obtained from the local Navy calibration laboratory.

Figure 54 shows the deviations from the nominal as measured by both the

digital meter and the EQUATE system. Since the output of the source is

50 a, the measured voltage is dependent on load impedance. An impedance

mismatch of approximately 4 percent could account for the difference

between the nominal value of 0.707 V ac and the value measured by the

digital voltmeter. The differences in reading between the digital voltmeter

and the EQUATE system, however, are not caused by mismatch between source

and load impedances.

5.4.3 Pulses

The NBS PULSE DURATION pulse source was used to test the Indianapolis

EQUATE station (serial #1) on three different PIU signal pin-shield

pin-pairs (HI-PIN 1, L0-PIN-1S, HI-PIN 19, L0-PIN 1 9S and HI-PIN 58,

L0-PIN 58S) and on the single available DIU BNC connector. As at Tobyhanna,

the station was instructed to make five complete sequential PULSE DURATION

measurements on each of the nominal pulse source calibrated pulses, i.e.,

50, 100, 200, 500, and 1000 ns. The 500 ns sharp-cutoff pulse was not

measured at Indianapolis due to time limitations. The nominal pulse

source pulse amplitudes were 2.50 V, and the nominal pulse repetition

frequency was 100 KHz in all cases.

The Indianapolis EQUATE measured data is summarized in tables 20

through 27. Tables 20, 22, and 24 represent the PIU unbuffered data, while

tables 21, 23, and 25 represent the buffered data. Table 26 contains the

DIU measurement data and table 27 contains data taken on the DIU to test

the effects of varying the DUTY CYCLE value in the voltage peak MAX/MIN

instructions. The arrangement of these tables is identical to that used

for the Tobyhanna data (tables 11 through 16).

41
Somewhat similar to the Tobyhanna measured data, the Indianapolis

data varied rather erratically, with percent deviations from nominal

ranging between 15.5 percent and less than 1 percent. Also, similar to

Tobyhanna was the fact that the unbuffered voltage peak maxima again

exhibited a monotonic increase with nominal pulse duration increases.

This trend was not observed in the buffered case, however.

In general, the buffered PIU measurement data appeared to be in

closer agreement with the NBS nominal values than the unbuffered PIU

data. Also, the single set of DIU measurement data taken at Indianapolis

was in the best agreement of all with a maximum deviation of only 5.1 percent.

The results of the PIU and DIU time domain reflectometry (TDR) tests

are shown in figures 55 through 57. Figure 55 shows the 50 0 TDR signature

looking into the single available DIU BNC connector. Ideally, if the

channel exhibited a perfect wi de-band 50 a impedance match, then the

signature would appear as a smooth, uniformly flat-topped step waveform.

The small deviations from flatness observed in the second and third time

divisions are due to the TDR test pulse used and not the EQUATE system.

The wiggles in the seventh and eighth time divisions, however, are caused

by the EQUATE DIU channel and indicate small (a few ohms) mismatches in

impedance.

Figures 56 and 57 are the TDR signatures of pin-pairs 1 and IS of

the PIU channel in the unbuffered and buffered modes, respectively. In this case the impedance deviations are much more significant than in the

DIU case. As a function of distance starting from the PIU ZIF connector

and looking into the PIU channel, the impedance first rises to about

100 ft (positive peak at the beginning of time division four), drops to

about 25 ft , and then meanders erratically back to about 50 ft in the

ninth time division. The buffered and unbuffered TDR signatures differ

noticeably only in time divisions six through nine. These large deviations

of impedance are strong indications that pulses in the nanosecond domain

measured through the PIU are appreciably distorted.

It was learned from Indianapolis site personnel that an ATLAS

instruction exists that causes the EQUATE station to measure and record a pulse waveform in its entirety and store this sampled data waveform

replica into the computer memory as a time series vector. A brief attempt

was made to exercise this system feature, but, for unknown reasons, no meaningful results were obtained.

6. RECOMMENDATIONS FOR FUTURE EFFORTS

This report describes a limited experimental investigation of the

measurement performance of two ATE stations (AN/USM-410 EQUATE). From

the experience of preparing transport standards, collecting the test

data, participating in various ATE-related meetings and conferences,

perusal of pertinent literature, other on-site visits, etc.,

recommendations concerning future efforts are contained in the sections

that follow.

42
6.1 Feasibility of Using Dynamic Transport Standards

The concept of performing an on-site, "in-situ," test of the system

performance characteristics at the stimulus/measurement interface connector,

using well -cal ibrated transport standards, has been demonstrated to have

merit. Measurement uncertainties that would otherwise be undetermined

can be quantified. An independent verification of the accuracy specification

for basic dc and ac voltage and pulse duration measurements, common to

most ATE system capability, can be established. The accuracy of other

measurement (and stimulus) parameters is also capable of being verified

in similar fashion. The in-situ, system test/calibration procedure

accounts for hidden errors due to signal path losses, noise interference

from pickup and cross-talk, and drifts or offsets in the electronics of

the ATE. More subtle deleterious effects due to special algorithms used

in the computer software or transmission/decoding errors in the digital

interfaces of the system are also reflected in the data obtained from

system performance verification/calibration testing. Section 5 in

this report describes in detail the measured deviations from the nominal

NBS value of the dc/ac voltage and pulse duration data on specified

channels of the two AN/USM-410 systems studied. These systems utilize

built-in secondary standards for dc and ac voltage as well as for frequency

(time base). Self-check and calibration software (SYSCAL) is also provided

for these systems. Nevertheless, significant deviations, both in magnitude

and number of data points, were obtained from these two systems.

Consequently, the feasibility of the dynamic transport standard concept

for performance checking and system calibration purposes has been verified

within the limitations mentioned.

6.1.1 Characteristics Desired

The stimulus sources for dc and ac voltage and for pulse duration,

used as transport standards as described in this report, have served

their purpose very well. However, as contrasted with present-day working

standards and test instruments used as transport standards, the attributes

of future dynamic transport standards (DTS) are anticipated to be the

following [10]:

(a) Designed to provide multi -parameter and multi-level stimulus and

measurement values, with a limited set of calibration reference points

which are independently monitored under statistical control.

(b) Designed to calibrate ATE on a dynamic as well as on a static

basis (ATE to be exercised at its operating speed; steady-state and

transient parameters of the signals to be considered).

(c) Designed to interface mechanically and electrically to standard

multipin connectors and adapters utilized for automatic testing purposes.

(d) Characterized and able to function over relatively wide

environmental and operating conditions, including the presence of

electromagnetic interference. Transportable and usable in working

environments of ATE.

43
(e) Designed to contain built-in microcomputers for data logging,

for remote programmability via standard buses (e.g., IEEE-488), and for

digital processing of data and control signals of the stimulus and

measurement hardware.

(f) Designed for rapid calibration against higher echelon standards

and to contain extensive self-diagnostic means.

Some of these attributes can be found in certain commercially

available signal sources, calibrators, and measuring instrument standards

today. Where these products have the above characteristics in sufficient

amount, they can be adapted as DTSs. Since it may not be commercially

viable for industry to invest in the R&D leading to more sophisticated

DTSs, there may be a role for NBS in developing prototype DTSs that would

exhibit most, if not all, of the above attributes. Since the results of

NBS work would be available to the whole industry, these prototypes may

then become patterns for the industry to adopt and commercialize.

One of the generic research problems that NBS will address, relative

to (a) above, is the generation, characterization, and measurement of

time-dependent signals over a wide dynamic range. That is, NBS will

undertake the development of DTSs whose stimulus and measurement parameters

are programmable and known to within a specified accuracy. It is with

such a DTS that the real-time measurement capabilities of electronic test

equipment can be ascertained under conditions which simulate the testing

of a UUT.

It is also proposed to incorporate testability schemes in the DTS to

provide efficient check-out and maintenance procedures and to detect

failure modes. Being potentially a complex structure of electronic

modules and components, the DTS will likely require built-in-test (BIT)

circuits which can diagnose improper functioning of at least the critical

digital portions of the DTS electronics. Several BIT methods presently

exist for the "self-checking" or "self-testing" of digital circuits [11].

These BIT circuits would not only help in diagnosing faults and minimizing

the maintenance time of the DTS, but could also increase the level of

confidence in the performance of the equipment as a standard (i.e., no subtle degradation effects).

6.1.2 Calibration and Characterization Methods

Several approaches and procedures are in common usage for providing

calibration support of ATE [12]. As detailed in many of the papers

referenced in [12], there are numerous shortcomings to the present piecemeal

approach of removing instruments or built-in standards from the system

for calibration at a remote metrology laboratory. Because of the need

for performing maintenance and/or repair on these items, however, it is

recognized that such "off-line" procedures are often very practical or may be the only viable calibration support available. In some cases, the

mean-ti me-between-fai 1 ures (MTBF) of the system is low so that the time

to run a system calibration significantly reduces the available up-time

44
for UUT testing. Nevertheless, where the MTBF of the ATE system is high

enough and transport standards can be made available which are compatible

(UUT/interface device adapter connectors, loading impedances, signal

levels, etc.), procedures for calibrating the system on-site at the

UUT/interface device adapter terminals are preferable.

The measurement data contained in this report (from the limited

experimental investigation of two EQUATE stations) does not constitute a comprehensive system calibration of the these stations. However, these

data are an indication that such a system calibration procedure could be

used either routinely or as an occasional verification test that system

specifications are being met in-situ. Various schemes for providing

internal calibration tests, and associated hardware adjustments or softwaregenerated offset and gain/attenuation corrections, are being incorporated

in many ATE systems. As microcomputers are utilized more in individual

instrument building blocks within a system, these internal calibration

means are distributed throughout the system. Therefore, whether the

system computer is directly involved as part of the stimulus and measurement

capability, as in the architecture of third generation systems such as EQUATE, or whether the signal processing is more distributed, as in the

architecture of "distributed intelligence" fourth generation systems,

independent verification of the calibrated system performance at the

UUT/interface adapter connecter plane is an important task in the metrology

support of the system.

Figure 58 illustrates the method whereby the present calibration

services and Measurement Assurance Program (MAP) provided by NBS for

basic electrical quantities can be augmented with the capabilities of

both ATE-specific and high accuracy DTSs, as described above [10]. A

viable method for supplementing the present ATE calibration hierarchy

would be to make use of the DTS concept. As indicated by the solid

arrowed lines, the normal path of support by means of an NBS DTS is

through a key standards or calibration laboratory. Commercial "roll-up"

standards which serve as working accuracy DTSs (dedicated, perhaps, to a specific ATE system) are then calibrated using the NBS DTS and any other

appropriate standards. The commercial DTS, in turn, is periodically used

to provide a system calibration at the UUT/interface device adapter of

the ATE. This periodic testing of system performance serves as a verification that built-in self-tests are maintaining the quality of the

measurements of the system. The removal of certain "core" stimulus or measurement equipment or built-in standards for testing and/or calibration

in a laboratory is still optional, of course, but may not be necessary.

6.2 Needs at NBS for Automated Calibration Support Systems

To assure that the metrology support of ATE system performance can efficiently be traced back to national laboratory standards at NBS, there

is a considerable need at this time for developing appropriate automatic

test and calibration systems. Some of the calibration services at NBS,

in fact, are already automated. But these setups are primarily dedicated

to providing support for the relatively few and generally fixed-value

transfer standards passed between NBS and corporate level standards

laboratories. As shown in figure 59, the DTS concept and calibration

45
support strategy implies a system whereby the relatively complex DTSs

can be readily maintained, i.e., wel 1 -characteri zed and calibrated.

Because of the various kinds, ranges, and levels of calibration

parameters of interest, and the need for a considerable amount of

documentation, automation of the calibration support system is essential.

As indicated in figure 59, desk-top or minicomputer-based systems are anticipated at NBS and at the key standards or calibration laboratory

to interface with the DTS and make the necessary comparison measurements.

Starting at NBS, the appropriate national laboratory standards

(item 1 in figure 59) are used to calibrate the variety of possible

quantities within the capability of the NBS DTSs (item 2). By virture

of attributes listed in (e) and (f) and BIT capability, the time and

effort required to completely characterize the DTS can be minimized.

Environmental testing of the DTS would also be performed, although it

is not shown on the diagram for sake of simplicity.

At the key standards or calibration laboratory level, the commercial

DTS (item 5) is calibrated against the NBS DTS. Such a laboratory has

working standards (item 3) as well as precise calibrators, for example,

programmable precision dc and ac sources (item 4). These items are brought into the calibration process in two ways -- (1) in conjunction

with the NBS DTS, they could facilitate the calibration of the commercial

DTS, and (2), more importantly, the NBS DTS may be used to calibrate the

standards, calibrators, and other precise test instruments in the key

laboratory. Many of the secondary standards and most of the test

instruments are programmable via standard buses (e.g., IEEE-488). Hie

DTS would therefore perform the task of updating the corrections to the

inventory of standards and test equipment. Either during or between

update cycles with the NBS DTS, the automatic test systems would be used

to verify or to make corrections to the commercial DTS which can be of

the form of "roll-up" standards or "calibration consoles" which serve a particular class of ATE.

The on-site ATE systems (item 6) are then tested by way of the

commercial DTS (item 5) to provide the needed step in the traceability

path for stimulus and measurement parameters at the interface of the ATE

system and the UUT. If possible, these calibrations of the ATE system

should include the effects of UUT interface device adapters, cables,

connectors, etc. Due to the large number of such special interface

hardware, however, it may be impractical to include the effects in every

case, but at least these tests will verify stimulus or measurement values

at the UUT connector panel

.

6.3 Recommendation for Future NBS ATE Efforts

Having demonstrated the need for, and viability of, in-situ ATE

performance verification by means of wel 1 -characteri zed and calibrated

sources used as transport standards, we propose to continue and expand

the work. In view of the great leverage obtained by a properly performing

ATE system on military weapons readiness, an expanded NBS program is felt

to be of significant cost effectiveness to the DoD. The beneficial

46
results of continuing this work are the improvements in system selfcalibration and self-test programs, and maintaining better test consistency,

uniformity, and traceability of measurements made by DoD's large inventory

of ATE systems.

6.3.1 Near-Term Extensions of Present JLC 30702 Project

Immediate efforts will be directed at extending the field studies

that have been carried out by NBS staff at both the Gaithersburg and

Boulder laboratories. The details of the proposed work are outlined in

the following tasks:

(1 ) Field Studies of Selected ATE Systems

Continue the field studies of selected ATE systems, using a wellcharacterized two-channel source of non-sinusoidal signals, the improved

pulse waveform stimulus source, and the dc-10 MHz source characterized

previously.

(2) Dual -Channel Signal Source For On-Site Calibration of ATE

Procure a signal source capable of generating two channels of

periodic waveforms, both sinusoidal and non-sinusoidal with frequencies up

to 100 kHz. Characterize this source for stability, temperature dependence,

and other environmental effects. Establish traceability of this source

by calibration against higher echelon standards at NBS.

(3) Improved Characterization Methods for Signal Sources

Continue and expand the investigation of improved characterization

methods for sources of periodic, sinusoidal, and non-sinusoidal signals.

Initially consider conventional techniques, including the rms amplitude

measurements using thermal converter-based automatic measurement systems.

Also, conduct theoretical and experimental investigations into viable

methods for accurately characterizing non-sinusoidal periodic waveshapes.

It is anticipated that the study will establish some fundamental principles

of waveshape characterization. It should identify trade-offs of accuracy

vs frequency and waveshape (harmonic content). Prospective characterization

methods for both sinusoidal and non-sinusoidal signal sources are by means of digital sampling techniques. Technology currently under

investigation at NBS for application to non-sinusoidal power measurements

will be used to extend voltage measurements to fundamental frequencies

up to 100 kHz. It is planned for the sampling voltage measurements to

extend to frequencies up to 1 MHz (10th harmonic of 100 kHz) and cover amplitudes from 100 mV rms to 1 00 V rms. The accuracy goal (at the 10 V rms level) is ±0.05 percent of FSR, dc to 100 kHz, degrading to 0.5 percent

at 1 MHz.

47
(4) Improved Pulse Waveform Stimulus Source

Modify the pulse waveform stimulus source that was used in the

initial ATE field tests to provide improved waveform amplitude control

and accuracy. Construct a reference flat pulse generator module for

improved waveform amplitude control in a dynamic sense. Initially, this

module will generate a 1.0 V (open circuit) step-like waveform with

0.6 ns transition duration with a source impedance of 50.0 ft. Begin

work on a set of lossy filters to be used with the flat pulse generator

to allow pulse transition durations in the range from 1 ns to 1 us nominally in a 1-2-5 sequence. Characterize this improved pulse stimulus

source and establish its traceability. Begin work to improve the drive

circuitry for the NBS Pulse Measurement System Sampling Head. These

improvements are expected to yield substantial increases in system

resolution and stability.

(5) Improved Automatic Pulse and Measurement System

Improve the existing Automatic Pulse and Measurement System (APMS)

which is used to characterize and calibrate the Pulse Waveform Stimulus

Generator. The latter is the signal source for field studies of

ATE stations. APMS is a computer-based equivalent-time sampling

analyzer capable of recording, measuring, and analyzing waveforms

with transition duration (rise times) in the sub-nanosecond region. In order to establish NBS traceability of the waveform measurement portion

of ATE systems, it is necessary to up-grade this NBS in-house support

facility. The current system is not adequate to develop standards and

traceability requirements for state-of-the-art ATE used by DoD. The

improved system should be capable of establishing pulse duration (and

pulse transition duration) within 1 percent from 10 ps to 1 ys, pulse

delay times within 1 percent from 5 ps to 1 ys, and pulse amplitudes

from 10 mV to 10 V within 1 percent.

6.3.2 Longer Range Program

The tasks described above will build a foundation at NBS for

providing basic metrology for supporting both present and future ATE

systems used by the DoD. We also propose a longer range effort which

would develop similar support for other critical measurement parameters

in the low frequency and pulse domain, as well as coverage of RF,

microwave/mi Hi meter wave, and optical regions of the electromagnetic

spectrum. For example, an RF signal source capable of generating signals

with amplitudes from 0.1 to 7 V rms and frequencies up to 100 MHz will

be accurately characteri zed for stability, temperature dependence, and

other environmental effects, and its traceability rigorously established

by calibration against higher echelon laboratory standards at NBS. This

source, and other high frequency dynamic transport standards to be developed,

will also need automatic calibration systems at NBS for proper support

as described in section 6.2.

48
7. ACKNOWLEDGEMENTS

The authors wish to express their appreciation to all those who have

made this report possible. W. J. Lord, J. P. Murnock, and J. Homish

provided us with assistance at the Tobyhanna Army Depot in Tobyhanna, PA.

H. Riebe, D. Leyden, and J. Ketner were most helpful at the Naval Avionics

Center, Indianapolis, IN.

Additionally, the following technical personnel of the National

Bureau of Standards made noteworthy contributions to this effort:

Dr. 0. Petersons, Chief, Electrosystems Division and J. R. Sorrells of

the Electrosystems Division.

Special appreciation is expressed to the editorial and secretarial

staff who produced this report and typed the manuscript: Bonnie Smith,

Betty A. Oravec, and Daria A. Edwards.

49
8. REFERENCES

[1]

W. L. Gans and J. R. Andrews, Time Domain Network Analyzer

for Measurement of RF and Microwave Components, Nat. Bur. Stand.

(U.S.) Technical Note 672, (Sept. 1975). [2]

W. L. Gans, Present Capabilities of the NBS Automatic Pulse Measurement

System, IEEE Trans. Instrum. Meas., Vol . IM-25, pp. 384-388,

(Dec. 1976).

[3]

J. R. Andrews and E. E. Baldwin, Amplitude Calibrator for Oscilloscopes,

Nat. Bur. Stand. (U.S.), NBSIR 81-1646 (April 1981).

[4]

IEEE Standard - Pulse Terms and Definitions, IEEE Std. 194-1977,

July 1 977.

[5]

IEEE Standard on Pulse Measurement and Analysis by Objective Techniques,

IEEE Std. 1 81 -1 977, July 1 977.

[6]

Pulse Techniques and Apparatus, Part 1: Pulse Terms and Definitions,

Publication 469-1, International Electrotechnical Commission, 1974.

[7]

Pulse Techniques and Apparatus, Part 2: Pulse Measurement and Analysis,

General Considerations, Publication 469-2, International Electrotechnical

Commission, 1 974.

[8]

Test Station, Electronic Equipment, AN/USM-410 (XE-3)(V), ET&DL

75-04513-002, Frequency Control and Signal Processing Devices

Technical Area, U.S. Army Electronics Technology and Devices Laboratory,

U.S. Army Electronics Command, 13 April 1976, pp. 42.

[9]

Test Station, Electronic Equipment, AN/USM-410 (XE-3)(V), ET&DL

75-04513-002, Frequency Control and Signal Processing Devices

Technical Area, U. S. Army Electronics Technology and Devices Laboratory,

U. S. Army Electronics Command, 13 April 1 976, pp. 14-16.

[10]

B. A. Bell and 0. Petersons, ATE Calibration by Means of Dynamic

Transport Standards, AUT0TESTC0N *81, Proceedings, pp. 280-287,

(Oct. 1981).

50
[11] J. B. Clary and R. A. Sacane, Self Testing Computers, IEEE Computer,

Vol . 12, (Oct. 1979).

[12] B. A. Bell, T. M. Souders, B. D. Belanger, and R. A. Kamper,

Challenges in Achieving ATE Traceability to NBS, AUTOTESTCON '79,

Proceedings, pp. 233-238 (Sept. 19-21 , 1979).

51
DEVIATION

OF

DC

OUTPUT

VOLTAGE

VS

OUTPUT

VOLTAGE

u<>ss

ID LD

_JOz<

Q_ 0 Z < O

u°?u Q u<3

~“ °'ii w c£<

t-CD co

•r—

-t-> t- C

a; co a* J r- > <o o x c

0.(0 0 0) o > u OJ O -r- co co < E •<- c _c .c c O +J 1— Q •r— •(—

Tj"

M C_ to U (O • <u

wmm

C CD CO CD

II 3 O

C <o CD

*— >— o

•r-

+-> CD ig ig v o O o

CO to OJ > m fO - 1- c_ o u •f— •o

OJ CO "O

CD-r- <4- * <t> x a> o — *-> fO >

r— 1 -r- <u _j O X J-> CD < > <u c

OJ CD to z pro c_ 3 -M C

CL OJ •

4-> P ’D X)

J 3 HJ C -r O O JC <0 X P— M <“ u OJ ig o

X) 0) > <*-

O)O +J (O *-> -C Z *r— »— <o

4-> t/> Q_ JC O l/MJ C • CL-r-

•r- O) 13 I/I CD O) 4-> <u nj r o o

CD 4-> -4-> 4_> r—

C. r- CL

<g ore; -C > +J jj gj U O CO JC 0IJ3 3+J

<D c

JC -iC CO *4— K— r— -r t— O

0)3

CD s s ca

<3 ID

Q <3 LD Q I —I

CL CL Z

52
DEVIATION

OF

AC

OUTPUT

VOLTAGE

VS

LINE

VOLTAGE

CU

N

-£Z ur

+J o .£=

+-> •r—s 4-O

a>o >i

$- (J 3 c o CU

to 3

cr

CU CU sz S-

+-> 4-

4- 03 o

T3

<u

C

cn 05

03

+-> > r—o o > • o 4->3 r—

CL

4-> -o 3 c o 03 a r

03 o

CU o sz r—

+-> c O •T— •

CUcn +J C 03 n3

j£Z -l-> a 3

Q.

CD 4-> -C 3

I—

O

n3

C\J

a)

s-cn

53
DEVIATION

OF

AC

OUTPUT

VOLTAGE

VS

LINE

VOLTAGE >

<s

ii CO

COo

CLO<

31O

N 2 I

CL

G>

O)

II LJ

CL<

Z>O

CO

N

n:o

to

d>0> (O

-*-> o>

-*-> 3

Q.

+-> 3O

<u

Cl

<UoX

0)

<T3 • CM

OJ

to

<o

<uE

<oto

d) e

-QCM

OJ

t_3

CT> |

Q_ Q. 31

54
DC

VOLTAGE

STABILITY

WITH T

IffE

Q

55

Figure

3,

The

change

of

the

dc

voltage

output

at

four

selected

voltages

over a

period

of

approximately

seven

months.
AC

VOLTAGE

STABILITY

WITH TI

ME

56

Figure

4.

The

change

of

the

ac

voltage

output

of

the

source

at

four

selected

voltage

and

frequency

combinations

over a

period

of

approximately

seven

months.
DEVIATION

OF

DC

VOLTAGE

SOURCE

FROM

NBS

STANDARD

— 00

00 o> CD -

CD K) X CO UJUD oao < < 3

h- 21 < O II II >

QJ LlI

_J _J O O — Ul

_JX

O 10 CO <Q

Q_ cln

57

Figure

5.

The

difference,

on

two

occasions,

between

the

dc

output

voltage

of

the

source

and

the

NBS

Legal

Volt

as

maintained

by

the

Electrical

Measurements

and

Standards

Division

of

NBS.
MOST

LEAST

SIGNIFICANT

SIGNIFICANT

DECADE

DECADE

QgUJh

111 tjg

58

Figure

6a.

The

interconnection

used

to

determine

the

difference

between

the

NBS

Legal

Volt

and

the

source

for

the

voltage

range

of
MOST

LEAST

SIGNIFICANT

SIGNIFICANT

DECADE

DECADE

|!

1

i

59

Figure

6b.

The

interconnection

used

to

determine

the

difference

between

the

NBS

Legal

Volt

and

the

source

for

the

voltage

range

of
60

Figure

6c.

The

system

used

to

determine

the

ac

voltage

of

the

source

in

terms

of

the

dc

voltage.

Both

the

source

and

the

voltmeter

may

be

controlled

by

means

of

the

IEEE-488

interface.
DC

TRANSFER —8

TO

20o<

LOQ

^r(3

K)

(3

CM

G>

00

O)

KlX>

<_> zw3o

UJ

cr. Ll

u

<DcnC

N

/o oc < c_ > o

CL) LO (3 -C CM +-> 4-

II

O

C_ 10 CD CD CO > CT> O C O to 01 co U CO >,

CD

•rU

IC

ra CD Q. 3 x M u a:

a. < < H X CO

CM CM <Q

II LlI _Ju

01-Hu

00

II UJ

o:<3

<3CO E cr 0 <u O £_

t- 4—

<U

4-> O) c XT

•r- +J O t_ "O O) 1 > u o

tO

Oa> C

-c <D

-t-> o

4- tO

N

CO

+-> o r- C\J zs n:

l/l

<L> +J

tO 00 LO

<u x: 4- o

i— o +->

/o

CD

=3O)

(3

Q

(3

CM S

(3

Q 6)

<3

(3

(3

CMI

61
DC

TRANSFER

8

TO

20

a. o. z:

62

Figure

7b.

The

same

intercomparison

as

shown

in

figure

6a

performed

three

months

later.
ALL

OUTPUTS

OF

DC

SOURCE

AT

VARIOUS

TEMPERATURES

<3

in

63

Figure

8.

The

limits

in

the

changes

of

the

output

voltage

of

the

source

over

the

temperature

range

0°

to

40°C.
TEMPERATURE

SENSITIVITY

OF

AC

CALIBRATOR c

d)

•r— QE

<u

cy>

0)

c_3

CD

•r—

Ll_

64

TEMPERATURE

(DECREES

CELSIUS)

CIRCLE

=7V, I

00HZ

SO=7V,50HZ

TRIANGLE

=.7V,2KHZ

ST

AR=. 7V, 1

0KHZ
START-UP

CHARACTERISTIC

OF

CALIBRATOR

65

Figure

10.

The

change

in

the

ac

output

voltage

of

the

so

function

of

time

after

the

source

is

powered.
DISTORTION

OF

SIGNAL

SOURCE

H- I Q + Z OL lxl Ql U LlI z. h66

ac

source

as

a

function

of

frequency

and

amplitude.
FLEXIBLE

DISK

DRIVE

VOLTAGE

AXIS c

UJ

Q_ O UJ O o

z z u <<-«»/) •-< Q

CO —I o _J c

UJ Cl _J Q. UJ o z: —

i

z: = <—t e£ <—

I

<

as v> o

t/) o

67

Figure

12.

NBS

Automatic

Pulse

Measurement

System

(APMS)

block

diagram.
g

id3

OIlSm H-OJW

_

_

Q_jcoyj 8k ir>8-«

UJZOh

(-U

2*-» a: *-t(OOld

•h*

3<X<0Z o id »ldO

oq!S

UJ?tK(0O

CL <XQ • Id

(0 XOO <0 •Hm • Q-K tt<0 2

LUZXld Id

to£

<1£ I IdldOfLld 3X3 X

(0ld<0_IK

U3o:Sx XCOldUOC^ H <E _J -» II ld^

IdCLCOXJ^gwo

Elf

II OEL K XIO UQK II

u

UJCO^X

IdX hZZld II ld(0

CQ Id

K <Z Id >K -J Id

U

(0X

O <T (T> UJ Id

ld«-OIOI-3CL 335 XCKH UJGCiXC0<EtO ZhDHdi | h.N^UJDQJOHU9l(h9lCD(h9lQ9iS HH HH(Q H

OMNNItllHttlJ

CL HHHHHHHHH

555555555

CpwrO<VIN©NOOO

rW 'f**-

^wro^ioidNa)(r>

555555555

feg222!fc8fef i ujk3u- 333Ld ffirW **•***• 4 °.\-g (DOGBj-jS QCO-J • »•••••••

«^ld Jua LuLlLl.

id ayuzzuiooO xuju.z<xu 5 hi *-»CJ *-• 3*-« DC ft. C£

•-• Pz^MWOhUJUl Jh 3hh !'- <1 S CO i CldQ'QZKId UgJ CXOOXCJUiXOUiSL*. hiflL^u5hQZZZZ Id (d td td td Id UJ SSSSSSSSi

H *-i Ib ©^(VirO^lOVDNCO •-• o4 $<h b g HHf- hh(D

68

Figure

13.

Typical

run

time

terminal

dialog

for

TCAL

time

axi

calibration

program.
Wg

£>J2Z ?<iouj

o_i2:

0*-i LiJ UhllJ^ tei3

55r$

I^SSli 2K^

H* ** 1—

UJ<0

J

zouiz h*u)M . QXU >-<Ei

O)d

d

*z <r<zh-t- 21- s g t ^ ^ I

|pgg§^6

22211222 ge

axis

rorororororowro

<o

4->

UlUJUIUJUJUiUJUJ <MvonNr)®ioK

ID U)~* onVO CMOS

gs<vj(vi^mwNro ooqooqipq OOOOOO^vv hhhhhhQ\h

O>1 c0>

t—0

<+- CD OCD CD CD CD CD CD

TCmm O|

CDO

<0 <00) 0) 0) 0) 0) 0) 0) UJ

VOB9 O

fOc

teteteteteteteu: OOOOOOOO E

£_ . <U E

-t-> fOC_ ooooooog a<i<r <1<L<L<L<L

tetetetetetetete

UJUJUIUJUJUJUJUJ

uouuuuuu

<00)0)0)0)55(00)

UIUJUIUJUJUJUJUJ IIIZZZXI

HNWtIO VON CO

8i s H % H •> H ^ h 2 EEEEEEEE _Z OOOOOOOO

zzzzzzzz

69
NBS/Commercial

Pulse

Source

Calibration

Configuration

i

•{

I

70

Figure

15.

NBS/commercial

pulse

source

calibration

configuration.
a>m3

Q.

a>

fO

£_o

H-mco

a> -oac

>>

CDo

10

a>3

CD

71
Figure 17. Graphical determination of occurrence density A - pulse

waveform with superimposed grid. B- probability density

histogram.

72
DC

UJO

a:CL

2

111 2

UJ

(0

<ru

<i

cl

L&J 2

LIU

tu

ClO

8

O

8

8!

g

a>©

OJ

s

o

u

0)

o

g

o

o h*

6) -JLU

ojc^* i«—

V Oh- > E^mm ht~o kq:

\ r a <r ah

crooxzu <x hE\D2 UJ 2 Uhw 2 hZUJD J *x

0*-Jg<!2 ml

UJ O EJZh *-»2>**

CL d h U. OO hHQQi

.(^UJ2(L2UJffl

jazi&Sj <ro '53

:o</)3«;(0

3!H

IH *X UJ

QC QCUt

<ECO*

-J3UJ JE

fc&5 fcg

_J »->U. “oUi °| 5a 0} H 5 h2

to

ujyj

C'-i-lji

. . W ^'_ g2h-CMC0l- O «xO»xtt IQOQC hh^jjaMj^

fetS^k'H 2c2 E -5 M EfcO_Q II H

uJxOUJ^ wUJxhh03h3> OZxLiJ 5 h53^u. 51> »- h- oc/5 ^ 2f- #o a ^ 55

73

Figure

18.

Typical

run

time

terminal

dialog

for

GMEAS

pulse

waveform

acquisition

program.
“MBS >5<r<E <h

UJ0UJ30

^0. UJ *** CD *-* UCDU -JU_*

CDUC^H^^I

{£5 Ul hh 'll

uj zh!

ECXJ<I 3

<r lu cdqo a 'JUCOZ 5x0 <L<H~>-

u. Ef

XOO^ZKI'-'WO

H'tfStt: _j uj *-* © OUJUJOhc/xviujLi.zu)oa

Ul N CO -«*-• <1 £

ttUDZ-ICDI-D 5z DU *-*H

& ouj8^k3!

ujuu-cdcdho; Z_J XU MDhUZhQC

:u.uju)zo <l

EqjjScd

couiD^o j

asusas “ jK Q

CD UJ CD (LHC* NH(£H io , h h

*CD • •— 5P(DH

g

i

s s

I

(VI

ro

«-• n m ~k«*

.\*uj

•©(75

*-•©-

cd© _ gy se 3

-C'S 2

55 «2g

K C4**"*0N

?®^® H

A

o

z

©

(0

£

R

f"

u

SI s

dS8 * CT W§*-« <T Lfc 23h HCDCL

WhOhQ

_

^

jS<rc^<rNDg H

QHMWOfOQEUJD

UJ

<"WW4J~:0 Oh23

~<$ooir5®u. llq

V7©^(\l I ffiCOQ

Ntfrofe CD (D HU

fa*to® u u<*Z(75 ‘ ,Scl!SP ?OUJ JEHUS H

OcS3oS

iX

fc

8

E8^lT8

H -S^O-U*

nun 5©arop«-» $e

^bWWftl c> S5338 fe 5 cmSS 8

8!

\‘ii-g

^MNh*

lf>_J (D

CD®*-*

OCWZX F-OHCD U HaHff.VHraHH X CD U.JE£S2 h2X H *-•

74

Figure

19.

Typical

run

time

terminal

dialog

for

PWA2KA

pulse

waveform

analysis

program.
HISTOGRAM

DU"/.*

0.078

UERT. *

49.

9999MU/UIU.

YMIN -

-49.9999

MU 2

Ot>CD(D«-«U>

<ri * _©L5 > 2* H R 5§HM

h-h-

<£<Z

M . r§§?wu- R R

iOE +

hhhhhtt

<y »-<»—i<Tn tii <rcoo>Gto-i

o> io>: pto: ujPi-ujiuco

c75 coo) JhQJJO po)Ujppi-

£woj5.2l

K

iii SH ^®Q Q

romco.v.v i rxvjio 1 - h(TiQO(S) t Ul * • ©CDLlJ E^smooo) a i o>a> • • roroo©3

a.

UJ

H

H B'.mh- 2gi5ll

75

Figure

20a.

100

ns,

400

mV

pulse

with

parameters

determined

from

MIN-MAX

definition.
HISTOGRAM

DU^*

0.078

UERT.«

49.9999MU/DIU.

YMIN

-49.99

99

MU

76

i

Figure

20b.

100

ns,

400

mV

pulse

with

parameters

determined

from

HISTOGRAM

definition.
HISTOGRAM

OU5!«

0.078

OERT.»

99.9990MU/'DIU.

YMIN

-499.9990 W

77

Figure

21.

20

ns

pulse

measured

directly

at

APMS

sampler

through 2m

length

of

RG-58C

50a

coaxial

cable

(MIN-MAX

definition).
HISTOGRAM

DU5C»

0.078

UERT.«

99.9998MU/0IU.

YMIN -

-499.9990

tfJ

78

Figure

22.

Same

pulse

as

shown

in

figure

21

with

special

NBS 3

mm

SMA/twin

lead

adapter

inserted

at

APMS

sampler

interface

plane.
0U%-

0.078

UERT.-

49.9999MU/UIU.

YMIN

-

-49.9999

MU

79

Figure

23.

Same

pulse

as

shown

in

figure

22

with

EQUATE

PIU

connector

and

twin

lead/BNC

adapter

inserted

at3

mm

SMA/

twin

lead

adapter

interface

plane.
Dljy.m

0.078

UERT.-

49.9999MU/DIU.

YMIN

-49.9999

HU RSB

is s

»*3 i a 55MHKh

P555!t*

|s|P;

222 I

2J8S.v,\*

!f|§

:T

96

aa

ZD^4< M

Sli

80

Figure

24a.

NBS

pulse

source

50

ns

pulse

direct

to

APMS

sampler

with 5

ns

NBS

filter

(MIN-MAX

definition).
OU50.

0.878

UERT.-

49.9999MU/01U.

YMIN «

-49.9999

MU *»j*| I I

55HHhh <0

wli I I

P555tft MMHH

lull , m

222 I

rb®- - MR I R R l

ii

j*88s:

81

Figure

24b.

NBS

pulse

source

50

ns

pulse

direct

to

APMS

sampler

with 5

ns

NBS

filter

(HISTOGRAM

definition).
HISTOGRAM

DUfc*

0.078

UERT.

49.9999MIM3IU.

YMIN

*49.9999

MU

NNi i

82

Figure

25a.

Same

pulse

as

shown

in

figure

24a

with

addition

of

EQUATE

PIU

connector

and

NBS

adapters

(MIN-MAX

definition).
HISTOGRAM

DUfc»

0.078

OERT."

49.9999MU/0IU .

VMIN

”49.9999

MU 6*

8' I • HH85 <n(0

•ii f

HMHMtt

IllHi waSoco'

vr*m\

HfiB I - cg SSo^rf

HizzI I * t

*55$

mt

83

Figure

25b.

Same

pulse

as

shown

in

figure

24b

with

addition

of

EQUATE

PIU

connector

and

NBS

adapters

(HISTOGRAM

definition).
HISTOGRAM

DU5C*

0.078

UERT.«

49.

9999MU/DIU.

YMIN

*49.9999

tfJ

Figure

26a.

NBS

pulse

source

100

ns

pulse

direct

to

APMS

sampler

with 5

ns

NBS

filter

(MIN-MAX

definition).
HISTOGRAM

DU*-

0.078

UERT.-

49

.

9999MU/DIU

.

YMIH

-

-49.9999

W

m <0~

I R

35HH f- hh <0

2

§ P555ii!t

(A MHHH 2 FFI-I-Fj

g|p

SIS*

zu I

9k

R

N *•< s m*-'

fit Q(D H

1 i?©ss

F HR

i

rS lBi§8

r-^-T-r i i "T^T-^

A

o

£

8b

Figure

26b.

NBS

pulse

source

100

ns

pulse

direct

to

APMS

sampler

with

5

ns

NBS

filter

(HISTOGRAM

definition).
HISTOGRAM

DU3S*

0.078

UERT.*

49.9999MU/'DIU.

YMIN

"49.

9999

MU

MS

86

Figure

27a.

Same

pulse

as

shown

in

figure

26a

with

addition

of

EQUATE

PIU

connector

and

NBS

adapters

(MIN-MAX

definition).
HISTOGRAM

DU5£-

0.078

OERT.-

49.9999WV0IU.

YftlN

-

-49.9999

MM

87

Figure

27b.

Same

pulse

as

shown

in

figure

26b

with

addition

of

EQUATE

PIU

connector

and

NBS

adapters

(HISTOGRAM

definition).
HISTOGRAM

DU&"

0.078

UERT -

49.9999M0/DIU.

YMIN •

-49.9999

ft) s

il

a

s«

Nh(

Sri ^ I I

55HM

ill.

eggs** MHHH hhhhhl

saa*

222g

l.V.N?

T

iii . . •88uj

St5S®I| - II I I i we

Hi|z||

Slfeli

88

Figure

28a.

NBS

pulse

source

200

ns

pulse

direct

to

APMS

sampler

with

50

ns

NBS

filter

(MIN-MAX

definition).
HISTOGRAM

DU*-

0.078

UERT.-

49.9999MU/DIU.

YWIN

-

-49.9999

MU

i

89

Figure

28b.

NBS

pulse

source

200

ns

pulse

direct

to

APMS

sampler

with

50

ns

NBS

filter

(HISTOGRAM

definition).
<c=5O'

4- c o o o <-

•r- C.

4-> *r- •r- <4— -O (1) T3 -O

ro

X

JZ < 4-j z: 5 z—

to z: oo —

oo

(/> 0) c-

«- QJ 3 4-> cn cl

•i- (O 4- T3

<o c

•i- oo

CO c z *O T3 JC C

</> (O

V) t-

<X5 o

4-5 a> o

i/> a> r— C 3 C

CL

OO

a>E o fO •—1 00 CL

<o

CTi OO

<u3

cn

_

90
HISTOGRAM

DUX0.078

UERT49.

9999MU/DIU

.

YMIN

»

-

49.9999

MU

, 1-r r4

$

a

isi

!*r

a a 55HH

>1

a

1 P555U£

hhhho

wh (0

i a

ie

if—

I

1(0

.iWL

*$«&

s i!*;:

<1 T ®® • • J

AO

£

91

Figure

29b.

Same

pulse

as

shown

in

figure

28b

with

addition

of

EQUATE

PIU

connector

and

NBS

adapters

(HISTOGRAM

definition).
HISTOGRAM

DU5c»

0.078

UERT."

49

.9999MU/DIU.

YMIN

-49.9

999

MU

92 *

Figure

30a.

NBS

pulse

source

500

ns

pulse

direct

to

APMS

sampler

with

50

ns

NBS

filter

(MIN-MAX

definition).
HISTOGRAM

EW5S0.078

UERT

.

49

.9999MU/DIU

.

YMIN

-49.9999

W

93

Figure

30b.

NBS

pulse

source

500

ns

pulse

direct

to

APMS

sampler

with

50

ns

NBS

filter

(HISTOGRAM

definition).
HISTOGRAM

DU5c»

0.078

UERT.-

49.

9999MO'DIU .

YMIN

-49.9999

MU &

isi MI

94 i

Figure

31a.

Same

pulse

as

shown

in

figure

30a

with

addition

of

EQUATE

PIU

connector

and

NBS

adapters

(MIN-MAX

definition).
HISTOGRAM

DU5{-

0.078

UERT.-

49.9999t1U/0IU.

YMIN

-

-49.9999

tfJ

95

Figure

31b.

Same

pulse

as

shown

in

figure

30b

with

addition

of

EQUATE

PIU

connector

and

NBS

adapters

(HISTOGRAM

definition).
96

Figure

32a.

NBS

pulse

source

500

ns

pulse

direct

to

APMS

sampler

with

5

ns

and

sharp-cutoff

NBS

filters

(MIN-MAX

definition).
HISTOGRAM

DO*-

0.078

UERT.-

99.9990MIM)IU.

YMIN -

-499.9090

MU

97

Figure

32b.

NBS

pulse

source

500

ns

pulse

direct

to

APMS

sampler

with 5

ns

and

sharp-cutoff

NBS

filters

(HISTOGRAM

definition).
HISTOGRAM

DV%*

0.078

VERT.*

99.

9999MU/0IU.

YMIN

*

-499.9990

MV

98

Figure

33a.

Same

pulse

as

shown

in

figure

32a

with

addition

of

EQUATE

PIU

connector

and

NBS

adapters

(MIN-MAX

definition).
HISTOGRAM

0.078

UERT.*

99

.9998MU/DIU

.

YMIN

-499.9990

MU

99

Figure

33b.

Same

pulse

as

shown

in

figure

32b

with

addition

of

EQUATE

PIU

connector

and

NBS

adapters

(HISTOGRAM

definition).
HISTOGRAM

tXA0.078

VERT.-

49.9999MU/'DIU.

YMIN

-

-49.9999

WJ

N

mt

1

i*a|

3

I I

85HHKh

iil-.f

P555!!!* HHHH hhhhhl

mil o)|3qu)!

r^am5 *

2£i S

<2©<viro<5©t?> a*^^N • j ttssS

I R

I UJH

I

4

R )

iITM I i—i—i—ii *

1 1 1 1

A

o- »5s!

£

Y« "• . S&I2

100

Figure

34a.

NBS

pulse

source

1000

ns

pulse

direct

to

APMS

sampler

with

50

ns

NBS

filter

(MIN-MAX

definition).
HISTOGRAM

DUfc0.078

UERT.-

49.9999MU/DIU.

YMIH

-49.9999

MU

i

101

Figure

34b.

NBS

pulse

source

1000

ns

pulse

direct

to

APMS

sampler

with

50

ns

NBS

filter

(HISTOGRAM

definition).
HISTOGRAM

DU^*

0.078

UERT*

49.9999MU/QIU .

YMIN

-49.9999 I “#tf

ihi

|8« S3

^*4 1 X

*-0-4 55 fZ

j^SSi.l

P555ST

HhhhHO

|S»|5S

w22Q«>!

«S«»L

l®****

5<rt*ro55

<L I T? (VI * _• ttos:

hi i I WH

migi

mis;

102

Figure

35a.

Same

pulse

as

shown

in

figure

34a

with

addition

of

EQUATE

PIU

connector

and

NBS

adapters

(MIN-MAX

definition).
HISTOGRAM

DU**

0.078

UERT.*

49.9999MU/0IU.

YMIH

*

"49

.

9999

MU

103

Figure

35b.

Same

pulse

as

shown

in

figure

34b

with

addition

of

EQUATE

PIU

connector

and

NBS

adapters

(HISTOGRAM

definition).
EQUATE

104

Figure

36.

The

interconnections

between

the

source

and

the

EQUATE

station.

All

cables

are

50n

impedance

and

have

the

same

length

as

used

in

the

calibration

of

the

source

and

fixture.
DISTRIBUTION

OF

ALL

DC

OBSERVATIONS

-

ARMY

<sK)

G>

CNJ

o

+-> c

<uo

t_ai

<S> Q

K)

co

<u

=303

ZDECQlilQ: O Li. OUUDCCQIUJZUUJCO

105

ERROR

(PERCENT)

ALL

VOLTAGES

4

ALL

INPUT

PINS

SHOWN
ALL

OBSERVATIONS

OF

DC

VOLTAGES

-

ARMY

S3

s

CM

<sS3

<S

Q

S3

I

i i ii ^"i rrr^

S3 S3 S3

M" K) CM

I I a

I I II II I I Mil II CM

I S3 S3 Q S3 — — CM

I I

u a: cc o cl i lUJttUliJZh

106

-

Figure

38.

The

error

(percent)

nominal

plotted

as

a

function

of

applied

voltage

over

the

range

of

-195

to

+195 V

dc.
ALL

OBSERVATIONS

OF

DC

VOLTAGES

-

ARMY

CO

CM

<S

CM

I

I

CO

I

K) CM (M

I

Ll) LD O

X

CO

CO o

>

u

CLQ_

<

UJQCQIOQC CL UJ QL O UJ Z Y107

Figure

39.

The

error

(percent)

nominal

plotted

asa

function

of

dc

voltage

over

the

range

of

-5

to

+5V

dc.
PIN-TO-PIN

REPRODUCIBILITY

FOR 1

00VDC -

ARMY CD

lo

y-lu

CD

CL

lO

ro

cn <

cl q. —. i < z

CL •-

CL cl z

LU •— ^ m Q- Z Li- Z) CO O z

f- LO

CL LO Z • CL O »—« M

CL Li- H- I < Z II CJ

C\J

Q_ LO _l

LiJ CL

_l UJ

(_) CL

CL•— II

LO

UJ

LO

LOO

CLU

CD CNJ s (M

T CD S s s Q Q1 Q1 S1 E R R 0 R 1 P E R C E Z h

108

Figure

40a.

The

pin-to-pin

reproducibility

measured

at

+100 V

dc
PIN-TO-PIN

REPRODUCIBILITY

FOR

-100VDC

-

ARMY CD

in

ro

co

I—u

CO

cl

*—

i

CO <

CL Q_

< Z

CL

Q_ CL Z

LlI *—' ^3" CD CL Z Ll

D CD O

Z

*- CO

CL CO Z — CL O

<£ i—i *—

t

Q.LH

I <

Z HU

•—

«

Q_ CO _J

LlI CL _l Ld

U CL CL

II U

CO

LlI CO

COO

CLU

CVJ if;

CD •<fr <M s (M ^r CD Q (SI Q Q Q

1

(S)

i S51 E R R 0 R 1 P E R C E N T

109

Figure

40b.

The

pin-to-pin

reproduci

bi1

i

ty

measured

at

-100 V

dc.
PIN-TO-PIN

REPRODUCIBILITY

FOR

-5VDC -

ARMY CD

lo

ro

CJ (j) hLlI CO

cl—

LO <

CL CL •— I < z

CL

—

CL

cl z

lli •—

i CD CL n ll 3 CD O z

•— LO

CL LO Z —i cl o

<£ t—i >—

CL Ll H- I < z II u

•—« •—

CL LO -I UJ CL

_J LJ O CL

CL—. II u

LO

LlI LO

LOO

CLU

CD <r CM

Q CM CD

<3 s Q <3 (31 (31 (31

LJ CLR 0 R 1 P E RC E N

T

no

Figure

40c.

The

pin-to-pin

reproducibility

measured

at

-5V

dc
DISTRIBUTION

OF

ALL

AC

OBSERVATIONS

*

2

:*0

1

LO

102

2 Z)

Ld CL U 2

CL —

«

Ld

CL _l — _)

<

CLO *0

CLCL LO Ld LdO

<

O

>

<3 <3 <3 S (3 ID Q ID GJ ID

(M CM — —

ZDEOQLdtt OLl O U O Z) CL CL Ld 2 CJ Ld CO

111

Figure

41.

A

histogram

of

the

error

(percent)

for

all

ac

voltage

observations.
AC

VOLTAGE

ERROR

VS.

VOLTAGE

ii

i

f\l<3

<3

I (3

Z

z*o

LlI X

O CO <

I- CO _l t- o z

> —

o

Q CL- UJ

I—I <

_J HCL <

CL D

<

K>

CD

•'T

U QC CC O CC Q_ LlI 0C (_) UJ Z I—

112

Figure

42.

The

error

(percent)

for

the

ac

voltage

observations

as

a

function

of

voltage.

Notice

the

abrupt

change

in

the

points
AC

VOLTAGE

DEVIATION

VS.

FREQUENCY

ID co

•r—U

c:

fX3

M

to

03 oto in co +-> •r- fO

+->

(T3 tO > -M

£_

C

<U -r- 10 O z .O Cl ? O

4- ,—. o <u O M X CO

TO

C

X CO -M

O

N—'

f— T— CO o to > £_ L— tu z O Q.

fO tO > •—«

•r—

u o 0) -o

t— z CL 4-> O) LlI JC 3 <

t_ +J o O h- 4- CU LlI < U

QC o +-> +-> Li. c o

01 z

fO o

CD £_

O) • Q- >0

C- <L) 0 3

L- CT

C- <D

<U L. 4—

01

CO

cu

CD

ID (3 ID

Q IDI (3I

LlI CL 01O CL CL Ld CL

O UJ Z h113
DISTRIBUTION

OF

ALL

DC

OBSERVATIONS

-

NAVY

I

i

& si S3 S3 S3 S3

s Q S S3 S3

in ho CM —

S3

S3

S3

S)

S3

in

S3

S3

S3

in

i

S3

S3

S

I

CO

COz

Z 3

U CL U Z

CL —

LJ

CL _J — _l

<

cl

o o

CLCL CO

LjJ LlI O

<

o

>

ZDEODUCT O U. O U CJ 3 CL CL LlJ Z O LjJ CO

114

Figure

44.

A

histogram

of

the

error

(percent)

for

all

the

dc

voltage
DISTRIBUTION

OF

"GOOD"

DC

OBSERVATIONS

-

NAVY

Q If) Q ID

(\l — *“

hO

C\J

I

CM

I

ro

i

z

ZXo

- X

h- CO

z

UJ CO

U I— cl z

1 1

1

*—

•

CL O

— CL

cl <

O H- cl <

cl a

lxl s

CSJ

'Jz Z) Z GO lxl CL OIL O O CJ ZD CL CL lxl Z U Lxl CO

115

Figure

45.

A

histogram

of

all

dc

observations

with

those

points

removed

that

were

in

error

by

more

than

50

percent.
420

OBSERVATIONS

OF

DC

VOLTAGES

-

NAVY

I

I

I

u o: ql o cc Q_ LlI Ct <_) l±J Z *-

116
420

OBSERVATIONS

OF

DC

VOLTAGE -

NAVY

<DCD

fO 4-> O>cooc3> sz

O) +-> o C—

<u <u _c >

l— o

r-^

a;

rjcn

117

APPLIED

VOLTAGE

ALL

INPUT

PINS

SHOWN

EXPANDED

VERTICAL

SCALE
PIN-TO-PIN

REPRODUCIBILITY

FOR

- 1

00VDC

-

NAVY

l I s

CD

in

CVJ

</> H-U

U)

cl

CO <

CL CL < z

CL —

QZ

—>

CD O

fO I

cl

u

CDz

Z>2 I- CO ^ CO z *CLO

*—

A U

£ 1 ~

^ CO O- UJ LlI _l CL CJ

Ct A — I CJ

COId

CO

COO

ccCJ

tr t

i—i—i—i—i—

i—i—

in <a in

Q Q q

i

tzacaac. i CL Ixl 01 CJ Ld

s

118

Figure

48.

The

pin-to-pin

reproducibility

measured

at

-100 V

dc
PIN-TO-PIN

REPRODUCIBILITY

FOR

-5VDC

-

NAVY

o

iTttrrTH TTn nr 1 1 FT 1

1 TT 1 1

in Q in (3 in IS in

in CNJ S CNJ in

s Q <3 ea Q (3 (3

i t i

CD

CO

h—

1x1 CO

cl

IT)

^1*

ro

OJ

cl

Ixl DOn3

to <

CL CL —. I < Z

CL —

CL Z

•—< <J" Q_

Ll CO O

cr<

CL

I

CL

h- CO

to z

CL O

i—i *—

i

lx t~<

A <_>

I k—

_l CO QIxl Ixl _J CL CJ

CL A —. I

CO

Ixl COCOo

o:o

U CL CL O Ct Q_ Ld CL U Lxl Z l—

119

Figure

49.

The

pin-to-pin

reproducibility

measured

at

-5V

dc.
PIN-TO-PIN

REPRODUCIBILITY

FOR

+5VDC

-

NAVY

i

i

CO

TTti—mh—m i i tth

n i i nrrr

If) Q in <3 in (3 in

N in c\j <3 (M in

S) Q Q S Q

1 (3i <3

i E R R 0 R 1 Cl LU CL U LU Z h~

CD

in

ro

<\j

CO

h-LU

CO

CL

CO <

CL Q_

•—• I < z

Q_ —

CL

CLLUCD

313

CD

cl

<

CL

I

CO

CL

LlO

COz

o

<

CJ

CO CL LU LJ

_J CL U

o: a

•—I I u

COLU

CO

COo

CLu

120

Figure

50.

The

pin-to-pin

reproducibility

measured

at

+5V

dc
DISTRIBUTION

OF

ALL

AC

OBSERVATIONS

-

NAVY K>

C\J

CM

I

K>

Kl

X

£}ID

U

<

>

CL

LlI U

X

LjJ £5

£2

cr. Ohcr 3 cr q_

IjJ 7

CO

u

o

<

o

>

s

CM

in s in

ZDLOQLlIQ: O Ll. OUUDQICCUJZUUC/)

121

Figure

51.

A

histogram

of

the

deviations

of

ac

voltages

as

measured

by

the

EQUATE

station

with

those

points

removed

that

were

in

error

by

more

than

50

percent.
AC

VOLTAGE

DEVIATION

VS.

VOLTAGE

I

I

z

;so

LJ X

LD CO <

I— CO

_l H

o z

> *“• o

Q CL- UJ

*—i <c _J t- CL <

CL Q

<

K)

CD

UJ CL CL O CL CLUJQCUUZH

122

Figure

52.

The

error

(percent)

for

the

ac

voltage

observations

as

function

of

voltage.
AC

VOLTAGE

DEVIATION

VS.

FREQUENCY

inss

K)Q

<\JSQ

KlX>uz

LlI 3O

LlI QL

Ll

-M

fO jr

ro +J

CO to +J

O

<0

C 4->

M p- X to O E C CL C_ z o o s •i— 4- l«_ in -O O

fO

C > C -r- K—

£_

O

a)•<-£_ < to tO JQ C_ r-

<_>

O ai -r- cl E < aj to >

CD t— to

ix3 ~a

4-> +J r- a> Z3 o r £ h- > -M CL -M UJ o a> c

fxi o a>

U •r- +J Av 0) +> X

.c o a> LU -M z

c_

i— a> Z O • to I* <4- >> (/) o a a> C i— X -M 0) LO C Z5 fO

a> cr 0 0)0

LO o £_ 4-> a> 4-

h- Q- to z -r- • O 1 •—«

£_ Nl o o c zn CL t— O -X

L- -r- a> +-> o < O LT) O C 1

-CO +J . < 1— 4— ro Q

_J 53. < 0)L.

ro

<u

lO

Q in o in <s i —i

LiJ Od Q:O Ct CLUQdULJZH123
AC

VOLTAGE

OBSERVATION

BETWEEN

0.6

AND

10

MHZ

i i i i

Nl

>

U

2

Ul

DO

UJ

cl

o

LD K) — (\J Q Q

2 2

< <

— hO

CNJ

CL —

CL

II

II UJ

tl -IUJ l uq:

cl <

ooco

uj cl cl o cr Q_ Ul CL U UJ 21-

124

Figure

54.

The

error

(percent)

of

ac

voltage

observations

between
0>oco

<0 • mm o©EP Q

c? olf>

aj XZ

4-O

CDt_3

-M

<T3 C

CD

(/)

+-> a>EO

+-> o

a>

a;c

•r—fCo

-o

<c

Lfi lo

<d

=3CD

125

BNC

connector

port

to

EQUATE.
aauopaduii 0Aj*D|ay

©

o

c

otn Q

©

E• mm

126

Figure

56.

The

time

domain

ref

lectometry

signature

of

pin-pair

1

and

IS

of

the

PIU

input

in

the

unbuffered

mode.
Q>OCo

V) • mmm Q©E

i127

Figure

57.

The

time

domain

ref

lectometry

signature

of

pin-pair 1

and

IS

of

the P

IU

input

in

the

buffered

mode.
A

t

Figure 58. ^cD^m

,lc Transport Standard concept and support strategy. Dashed lines indicate that the transport standard is physically moved from one location to another.

P y *

128
KEY

STANDARDS/CALIBRATION

LABORATORY

129

Figure

59.

Dynamic

Transport

Standards

for

supplementing

the

present

ATE

calibration

hierarchy.
Table 1A

Manufacturer's specification for the dc source

RANGE RESOLUTION RIPPLE AND NOISE

+-(20 mV to iuV <0.01% of setting + 199.999 mV) 25 uV rMs

+-(0.2 V to 10 uV <0.01% of setting + 1.99999 V) 25 uV rMs

+- ( 2 V to 100 uV <0.01% of setting + 19.9999 V) 25 uV rMs

+-(20V to 1 mV <0.05% of setting

199.999 V)

The six Month accuracy for all the above ranges is

+-(0.005% of setting + 0.001% of range + 5 uV)

over a teMperature range of 20*C to 30*C.

Table IB

Manufacturer's specification for the ac source

RANGE RESOLUTION FREQUENCY RANGE

0.2 to

1.99999 V

r> O 50 Hz to 50 kHz

2 V to

19.9999 V

100 uV 50 Hz to 50 kHz

20 V to

110 V

1 mV 50 Hz to 20 kHz

110 V to

199.999 V

1 mV 50 Hz to 1 kHz

The six Month aMplitude accuracy is:

+-(0.05% of setting + 0.005% of range + 50 uV)

over a frequency range of 50 Hz to 10 kHz and over

a teMperature range of 20*C to 30*C.

The six Month aMplitude accuracy is:

+-(0.08% of setting + 0.008% of range + 50 uV)

over a frequency range of >10 kHz to 50 kHz and over

a teMperature range of 20*C to 30#C.

130
Table 1C

Manufacturer's specifications for the wideband source

RANGE ACCURACY

31 . 62 mV to

99.999 mV

+-(0.25% of setting +

0 . 25% of range

)

0.1 V to

0.316 V

+-(0.75% of setting + 0.25% of range)

0.316 V to

0.99999 V

+-(0.50% of setting + 0.25% of range)

1.0 V to

3. 16 V

+-(0.25% of setting + 0.25% of range)

The frequency flatness over the frequency range

of i MHz to 5 Mhz is 0.25%.

Over the frequency range of 5MHz to 10 MHz, the

flatness is +- 0.6%.

131
(3

measurements

per

entry)

X

a z

in©+

•7mo+

*701

oo

CN dI

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00C > «?

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lO

nom

H

O

00 CO

CM *H

On

O

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H HO *H »H O »H C- CM

CM CM

»H ONmONN U0 CM

•h *7 r* co

CO CM . * £ l> E

co o O ON *7 co

on

on oo

co co

f—i CM O On

*7 CO

v© CM

ON 00

CO CO

CO CO

*H

O o o

CM CO

»H

O o o

co r*

iH

O o o

00 uo

CM CO o o N

OO

CD

4->c

>>

oo

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O

v© CM o ro d o U1 U1

a)

M 0) « H c e CM •JM m to

<D JD

UiO

IT3 o X

X1 1 1— g£ x X

cm on

m c* in

cm a\ Cn. CM 00 fH co O 00 rH on o o O ON O ON in m m *7 m -7

0) co co co co co c e e c C c m m m m in m H H m m X X X X

t->

H in in s s go o O zB3 5« u o z z

03 « w *H 00 rH oo H 00 "" 00 < ^ m m Q C- CM CM V, 'v

*7 vO *7 NO

00 oo

r* iH *7 c* >7 C'

132
Table

3.

Time

synthesizer

calibration -

data

log100

ns

nominal

O

Q Z H< N

00mo+

sO

tOo+

CM

rHOI 01 c D -T sO co cn cn oo m os cn

C"l *H rH CM , ° B l> w

cn os

oo

m

m c*

CM rH

so OS

IT» rH

cn I I l

CD o m cm

rH

O

CO OS CM

rH

O

<1) Q.

to -Mc

a>E

<D , «0 >

l> e

oom

cm cn cn m O O' om os o O'

cn

cn ih

r>» cm

cm cn O os ^ cn

m oo O r* O os ^ cn

Z3CO

a*

CO

cm cn

rH rH o o m cm

*H rH O O

un o rH rH o o d CO - e

00 c*

in cn

r- cn

os o

O' o

in <r so CM

cn O' O Os

cmin cn

so Os Os

os os

so O' in cn

r*. vo O' O'

os os «

(d as CO CO CO CO CO OO CO H c c e e c c C G

hJM

m in tn in u-» in in

m

bao

IS ? X1 H

COM

HCOw z z1 1 H

H

CO CO M M

wX z X z z z z Z X Xz uz

CJz uz

CJz zz zz o CO CO CQ CO M M W M

rH rH

w rH 00 rH 00 rH rH rH rH H 00 00 — 00 00 00 00 < sO sO a r* CM cm Cn. PM cm sO so i
o o z H< N

00

(Noi

r*. cno

03o

cz ooCM < D E

cn o oo oo > , o e > w

00 >3 m o\

CN rH I I o On oo

CN

04

O

rH 00 00 -3 CN

vO I I

CO >n o L. ON 00 <3 r— 4-> < D > m in m <r CZ E O rH o o

03 CD w* • * • • 4-> 03 “O CDQ.

vO vO

onm

O rH

00 sO 1 co > co o O

co > E O ON

O co

w <r co «3 cn

CZ +-> o CZ

•r— CD 4-> E

03 CD

L_ L. -Q Z3

•r— CO f— 03

03 CD cn CN rH 3 m < D c co m sO 00 O E >- ° o o o

L_ CO

CL) ^—

M f". r- *3- cn

•i— cn CN 00 CO . Q CO rH vO >3 00 H C

CD 1 w

O ON

O ON JZ O ON O ON -M CN rH CN rH

cz>3

CO

<DE

otf Ed cn cn cn cn H d c e c M o o o o

cn cn

m

m

CD

Q * r— O

HH

-Q

03 h- 6w£

M-M M-M coM0 0M0 X CJ o o U 2 z z z z U 0 0 0 0 w rH 00

00 ^VO 00 CN—

*3 sO

rH 00

00 ^V0

00 CN ^ ’-s. *3 0

rH rH co 00

CO 0 < *3

134 ;
Table

5.

Time

synthesizer

calibration -

data

log500

ns

nominal

r

jl

x ON o m m

a 2 • H< o © I I < O %

CNvD

m o

'Om

vOm , ° B l> w m oo «3 O' m <r i I

rH

O

m

m

•3 -3 l l o0nO1 m

+-> c < o >

CD 3 m o cn

rH

O

CDQ.

O vO<3

CO

4-> C

<D

l> >6

CN rH

rH

O •4- «3

<D

CO

<T3 CDE

CO

CO NO o O C r» *3 w o O I Q co H C

rH VO

<r

co ON

*H on O ON m >3

vO

CN NO *3 3 rH rH O m h ci no r"* mm »h no

oo ON CN oo

ON GO «H ON mm *3 m m m on

cnm -3 o

rH

O

OO

no

m - m

oo 3 rH NO m *3* 00 m m rH rH m o o O O m m m m

azw CO CO CO CO to CO Hi C C C C C c HM o o O O o O

1*4mmmmmm

QOE 2 2 l l H

H

CO CO M M

X1 HcnM

W2 2 2 2 X s X

CNX BNC BNC BNC BNC ITT ITT

rH rH

w rH 00 rH 00 rH rH H 00 00 ^ 00 00 < ^ O ^ O \ Q co m ao m 00 00 

— •3* NO *3 vO *3 >3 *3

135
Table

6.

Time

synthesizer

calibration -

data

logspecial

bUO

ns

nominal

(3

measurements

per

entry)

Q Z H< N o01 oo < D m co

CM rH

co

•O 00

CM

O ovO

00

l> > 0 B

co cr\ co m

oo so co co i I

sO Os

no

ml l

in

Osco

coI

Os

OCM ^ CO

•H Csl 00

*3- \o oo

m

sO <r cm »h

m

CO > iH <r > e oo so w ^ ^

00 sO O Os

CO

CO co

rH CO o o

rH SO

rH CM O O

in

oso

|H

m cm

osm co o o o o m m ^ co N iHm o o o o m m omoom

osw5QO

u. u. + +

03 0) c e

iom £ £ £ £

u» l*4 6u + + + a a) e c S m m U1 H H £ C/3 C/3 W M £ X X o u z z X X o u z z X X SM

wH<Q

rH 00 00 ^ ^ O Os CO ^ '—

*0 SO

rH

rH 00 rH

00 00 ^ o '—

Os CO Os

so

136

4/9/81

ITT

HIST

5ns +F

500.887

.14

409.89

2.2

-5.34
Table

7.

Time

synthesizer

calibration -

data

log1U0U

ns

nominal ZO «H O Z O H< « OI < D >e m © 00 cn

N

H

O

O o o

rH rH

eoj

(0 0)

0) o o s e

CM CM I I I I I I o

l>

v£>

O

\D s£> OsI I I I I I I I I m

osi m

osI

inm rH vD co

CM SO

L.

a;Q.

cn

+-> c

(D

a;

L_3

CO

03

a;

l> ^ ON Om os

cn o

ONm in o o

CO I I I I I I I I

ooOsm

CM

sOo

CM

<N

m oo n* so

Os Os

O' Os ON OS

ON

CM

00 00

OsOs

ON

Os

Os

Os

ctf Id

a cn CO CO

H

G c c c

#-3 M

© o o o

Ch

m

m

mm o ' o H H

H

X z z to CO s CO H 1 M M i M

Cd z z X z s X zX o u u CJ H H z z z z z H H

CJ CO CO 00 CQ

M

H

Cd rH rH rH rH H 00 00 CO CO 00 00 <O OS rH Os i—1

OS ON *0 C* <•

137
Table 8A

DC voltage

SEQUENCE NUMBER

12

3

4

5

6

7

8

9

10

11

12

13

14

15

16

17

18

19

20

21

22

23

24

25

26

27

28

29

30

31

32

33

34

35

36

37

38

39

40

41

42

43

44

sequences used

DC VOLTAGE

-.500

-.100

100 .000

.500

.100

10.000

-50.000

-100 .000

1.000

-1 .000

-10 .000

50 .000

-5.000

5.000

-.500

- 100.000

. 100

.500

-50.000

10 . 000

-.100

5.000

100 .000

1 .000

-5.000

- 10.000

-1 .000

50.000

- 100.000

-5.000

50 .000

- 50 . 000

.500

1 .000

10.000

-1 .000

100 .000 - 10 .000

-.500

-.100

5 .000

-.100

195.000

- 195.000

on Arny EQUATE

138
Table 8B

Low-frequency voltage sequences used on Arny EQUATE

i 3.000 100 .

0

2 .300 500 . 3 3.000 500 . 4 .300 5000 .

0

5 .700 2000 . 6 .700 100.0

7 .700 100.0

8 7.000 10000 .

0

9 .700 50 .

0

10 .300 50 .0

11 30 . 000 10000 .

0

12 .300 10000.0

13 .300 20000 .

0

14 7.000 1000 .

0

15 .300 1000.0

16 30 .000 50 .

0

17 7.000 500 .

0

18 3 .000 200 .

0

19 30 .000 5000.0

20 70 .000 1000 .

0

21 70 .000 10000.0

22 .300 100.0

23 . 300 £00.0

24 .700 200 .

0

25 7.000 200 .

0

26 7.000 20000 .

0

27 .700 1000.0

28 3 .000 2000.0

29 3.000 1000 .

0

30 3 .000 50 .0

31 .700 20000 .

0

32 3 .000 5000 .

0

33 3.000 10000 .

0

34 70 .000 500 .

0

35 7.000 100 . 0

36 7.000 50000 .

0

37 .300 50000.0

38 .700 5000 .

0

39 .700 500.0

40 70 .000 100 .

0

41 .300 2000 .

0

42 7.000 5000 .

0

43 30 .000 200 .

0

44 7 .000 2000 .

0

45 3.000 50000.0

46 70 .000 50 .

0

47 70 . 000 2000.0

48 .700 10000 .

0

49 30 .000 2000.0

50 30 .000 20000 .

0

51 70 .000 sooo . 0

139
I

Table 8B (cont.

)

52 30.000 100 . 0

53 7.000 50 .

0

54 .700 50000 . 55 30 .000 1000.0

56 70.000 200.0

57 30 .000 500.0

58 3.000 20000 .

0

140
Table 9

Sample printout of dc data, after reduction,

from Amy EQUATE system

APPLIED V

4i

MEASURED V RATIO ERROR PCNT

$

-.50000 -.50353 1 .00705 - .7004

10000 -.10364 1 . 03641 -3.5127

100.00000 100.22868 1 .00229 - .2282

.50000 .49605 .99210 . 7966

.10000 . 09631 .96310 3.8312

10.00000 10 .00426 1 .00043 - . 0426

- 50 .00000 - 49.96118 .99922 . 0777

- 100.00000 - 100.03119 1 .00031 -.0312

1 .00000 .99576 .99576 .4260

-1 .00000 - 1 .00262 1 .00262 - .2614

- 10.00000 - 9.99590 .99959 . 0410

50 .00000 49.97308 .99946 . 0539

-5.00000 - 5.00181 1 .00036 -.0362

5.00000 4.99600 .99920 . 0800

-.50000 -.50332 1 .00664 - . 6599

-100 . 00000 - 99.91592 .99916 . 0842

.10000 .09623 .96232 3.9150

.50000 .49610 .99221 .7853

-50 .00000 - 49.96062 .99921 . 0788

10.00000 10.00462 1 . 00046 -.0462

-.10000 -.10357 1 . 03571 - 3.4479

5.00000 4.99618 .99924 . 0765

100 .00000 100.23994 1 .00240 - .2394

1 . 00000 .99568 .99568 . 4334

-5.00000 -5.00194 1.00039 - . 0387

- 10.00000 -9.99588 .99959 . 0413

-1 .00000 - 1 .00249 1.00249 -.2484

50 . 00000 49.97234 .99945 .0554

-100 . 00000 - 100.01367 1 .00014 -.0137

-5.00000 -5.00175 1 .00035 - . 0350

50 .00000 49.97245 .99945 . 0551

-50 .00000 -49.95908 .99918 . 0819

.50000 .49616 .99231 . 7745

1 .00000 .99572 .99572 .4300

10.00000 10.00486 1 .00049 - . 0486

-1 .00000 - 1 .00266 1 .00266 - .2654

100.00000 100.23750 1 .00238 - . 2369

-10 .00000 -9.99586 .99959 . 0414

-.50000 -.50340 1 .00681 - .6762

-.10000 -.10359 1 . 03591 -3.4669

5.00000 4.99613 .99923 . 0774

-.10000 -.10363 1 . 03629 -3.5024

195.00000 195.33877 1 . 00174 - . 1734

- 195.00000 - 195.18068 1 .00093 -.0926

141
Table 10

Sample printout of ac data, after reduction,

from Army EQUATE System

APPLIED U MEASURED V FREQUENCY PERCENT ERROR

3.00000 2.99754477 100 . . 082

.30000 .29978985 500 . . 070

3.00000 2.99758220 500 . . 081

.30000 .29942834 5000 . . 191

.70000 .69886835 2000 . . 162

.70000 .69938251 100 . . 088

.70000 .69954770 100 . . 065

7.00000 7.14126986 10000

-1 .978

.70000 .69922926 50 . . 110

.30000 .29963950 50 . . 120

30 .00000 30.70935559 10000

-2.310

.30000 .30006786 10000

-.023

.30000 .30002379 20000

-.008

7.00000 7.14130872 1000 . -1 .979

.30000 .29979953 1000 . .067

30 .00000 30.58493733 50 . -1 .913

7.00000 7.14023173 500 . -1.964

3.00000 2.99770084 200 . . 077

30 .00000 30.62698221 5000 . -2.047

70 .00000 71.33996201 1000 . -1 .878

70 .00000 71.59404945 10000

-2.227

.30000 .29977548 100 . . 075

.30000 .29978710 200 . . 071

.70000 .69945042 200 . . 079

7.00000 7.14110744 200 . -1 .976

7.00000 7.02341473 20000

-.333

.70000 .69951895 1000 . . 069

3.00000 2.99936682 2000 . .021

3.00000 2.99737918 1000 . . 087

3.00000 2.99648333 50 . . 117

.70000 .69940271 20000

. 085

3.00000 2.99820191 5000 . . 060

3.00000 3.00513595 10000

-.171

70 .00000 71.32908630 500 . -1 .863

7.00000 7.13945842 100 . -1 .953

7.00000 7.66707331 50000

-8.700

.30000 .28643311 50000

4 .736

.70000 .69859734 5000 . . 201

.70000 .69963965 500 . . 052

70 .00000 71.34128952 100 . -1 .880

.30000 .29995621 2000 . . 015

7.00000 7.14309901 5000 . -2.003

30 .00000 30.60174537 200 . -1 .966

7.00000 7.14504111 2000 . -2.030

3.00000 2.91203383 50000

3.021

70 .00000 71.31357765 50 . -1 .842

70 .00000 71 . 28763948 2000 . -1.806

.70000 .69992207 10000 . .011

30.00000 30.60777283 2000 . -1.986

142
Table 1 0 (cont.

)

30 .00000 30.94726372 20000 . -3.061

70 .00000 71.38788986 5000 . -1 .944

30 .00000 30.59872627 100 . - 1.957

7.00000 7.13741744 50 . -1 .925

.70000 .69159294 50000 . 1.216

30 .00000 30.59998322 1000 . -1 .961

70 .00000 71.32343292 200 . -1 .856

30 .00000 30.60639238 500 . -1 .981

3.00000 3.01078960 20000 . -.358
Table

11.

Pulse

Measurement

Data,

April

1981,

Army

EQUATE

System

PIU

Pins

1

and

11

I

I

i

<N O

d fH

I I ON 00

I I CM <M

I I CM CM

I I

H< ON co

I I ro

I

CO CM

cn cm fH fH

I I

00 00 CM © *H f-4

I I Hto w

ps co u o < 3 3 0

o

3

ooo

l> d

I d

I d

I d

I d

I

^ 00

*£ d d w | |

00 N ON N co >d d co ^ m <CO d d d cn d d d nO d d

d d

I I d d

I I d d d

I I I d d d d d

I I I I I d <r

l l

< D >

a

m

d

IT> 00 d CM

m

co

co

m

o

o

d

com

o

d

d

o

m

00 N H CO N

> \0 O O «H On g co co *d co co w co co CO co co

U0 CM CM rH uo H CO CO CM CM O O O O On d d *d d co

d d cm cm cm 00 00 CO CO co o o o o o

d d d d d

H H H »/i © O © © d d d d d d d dco oo co oo N

OOOOr- m m uo m «d d d d d d

fH H o d

/-—V • fH rH o rH

cn tH c * w

sO CM CM VO O cnc ON fH ON o d On ON CO ON

fH d d

O o o o o o o o O O O O O O O O o o o O o o o © O

0) 00 CM o o CO o o CM CM CM oo NO NO oo 00 o o o oo o oo o o O CM £ d in m m d On OS On On On ON ON ON On os ON On ON 00 ON 00 ON ON ON ON fH H fH fH fH d d d d d d d d d d

c

o

CO <D -rt 00 m

co cn 4J o cn oo oo 2 H (0 3 U © ON o

1 fH o

CL. 3 m ON © O o

o CM m m

144

999.8

988.0

461.5

-4.0

988.0

461.5

-4.2

988.0

461.5

-4.3

988

'°

461.5

-4.9

WC

-11.8

-1.2

988.0

988.0

0

456.0

459.7

2.5

-4.3

-4.1

0.18

MEAN

-11.8

-1.2
Table

12.

Pulse

Measurement

Data,

April

1981,

Army

EQUATE

System

I*

SO so

I I

H

I 00 w

OS CO u o < 3^0

SO

co

I

fHco cm

l I

00 so CM CM

I I

CM CM CM CM

I I

SO

• © © 00 co m co ® • • . CO CO • •

1 so m *H *H o ©

l i 1 1 fH »H

< D

ooo

©

CM

CMo o m CO o o

© o

co

u

3

CO

I

co

<r

I

CM

*4

I

Os

CO

CO41

I I

00

“O M

X

/-N > 4 co 4 CM CO 4 co Os 4 4 CM co 4 Os CO O' O' © O' o CM CO 4 *4 CO os n* Os © O' c. > E 4 4 4 4 4 4 co 4 4 •4* 4 4 CO 4 co CO CO *4 4 *4 *4 *4 •4 co <o CO CO co

<n 1 1 1 l l 1 1 1 1 1 l I i 1 1 1 i •

I 1 1 1 1 1 1 1 1 1

toc

Cl. 4 CO co CM CM

CM

ZD V D %

CM co CM d CM

CO »—

1

Q.

O' m CM O

© • • • d Hi >

B

*H m m O' s£> 4 o *4 *4 *4 *> CO 4 *4 *4 4

>

OHIO H 00

• • • • • > in © oo © m wB <r m <r m *4

co co co co co

CM so CM CM CM O m

CO 4" CO CO CO OS co O os O O O H H

4 CO 4 4 4 4 4

in CM vO so so so H

co m ^ m m m mo H H H 4 4 4 4 *4 4 4 *3* 4 4 4

sO - CM N vO 00 00 m co os m o o 4 44444o »n so o m

N (O N sO H so so m m so 44444

< D o

o

©

4

CM

fH

OS © © © o

*4 © © ©

O' O'

»H *4 -4 O'

©

l- o o o o

o • • • • 44444 • 4 4 4 4

o o o o o

GO CM CM CM CM 00 Os O' Os O' o o o o o

4 4 ^ VO vO

Os Os O' O' O' o © © o ©

00 O 00 GO o 00 OS 00 GO os 4 4 4 4 4

© © © © ©

© © © © © Os Os Os O' O' 4 4 44 4

© © © © ©

00 00 o © 00 © © Os OS © O' O' O' O' os

e

OJ

0) O

•HU ©

O m CO © © © rH CO 3 u d Os o H o Os

Pm 3 m Os o O © Os Q CM m m O'

145

i

3.8

0.09

MEAN

-11.0

-l.J
Table

13.

Pulse

Measurement

Data,

April

1981,

Army

EQUATE

System

I

oo

l I •H OI I

© a*

CM fH CM rH

I I o

fH

I

O' 00 00

r*

I CM O

I I O' ON

I I

00 CM O ON rH

I I

00

ON

I H

n to w

ct co o o <

3 3 u

u

3 u

3 Sr u

3: O

3

e o o

co

I co

c\j ON

"Oc

HD

/-n O On On On <0 >

6 < n n co w I I I il

On O On ^ ON O' On CO O' On O' CO 00 O' ON O' i/i 0"C N m -o -o ^ co <r

l i I co

l co co CO CO CO CO CO

I I I CO

I co CO CO CO co

I I I I I CO CO

I I CO CO CO

I I I oC\J

toc

a_

< D

CO

CM

< >

l> w

ONfH

CO

nOOnCO

COONco

CO

•o

ON

co om*3-

O O ^ r* CM CO fH ON ST

CM rH CM H rH CO CO co co CO

r* m px, c^ r>» cm 'O O' On 9\ On rH On ^ H H 00 00 00 00 00 n cn4 n rs

On O' On O'

CO CO CO CO

ON ON

co co N 00 o ON O' o n co ^

<*0 ^ ^ 'O ^ CO CO CO CO CO

*0 *3* ^ *0 o ^

O co o o o

O O

^ ^

o o o o o mm m m m ^ <r *3- *3 *-3

< D

O'©ONoONo

ONo

ONo

|h om

CMON

CM

ON ON

*3 o

O'On O O O O O

O CM O m m m

CM o

m m

o o o o o o o o o o

oo o o o o ON O O O O fH CM CM CM CM

o o o o o

CM CM *3

On On On

ST «3 >3

CM CM

ON On

««3 «3

O O O O O i t t • • O CM CM CM CM

O' O' O' On On

<r <* *3 *3 *3

o o o o o • • # i # O O O CM O O' O' O' O' O' O' On On On On

C

0

in 0> •H 00 m CQ 0) 4J o r*. CO oo z rH CO • 00 00 3 U o On o fH • Qu 3 m On o O o ON a CM m o On

i

f

1

146

0.04

MEAN

-

9.4

-0.9
Table

14.

Pulse

Measurement

Data,

April

1981,

Army

EQUATE

System

DIU

BNC

#1

<3 w

vO NO

rH *H

I I I I

CM rH

I I

ON©

i i i o o

I I

GO 00

I I

00 CO

I I 4 col i I NO NO

I I

H

U CO W

QC (A u o < 3 3 u

u3

CJ3

< D

VO

rHo

CO

I COI co

I coI CO

I

25

HH

T. >

/*-s On On On On On

=1 7

'

* * * w |

On On On ^ On On On N On On nO 40 nO NO On On On On On On On N On On

CO CO CO CO

I I I I CO co CO

I I I co coI I CO CO CO co CO

I I I I I co co co co till CO COI I co co co

I I I CO CO CO CO COI I I I I

< o >

e

NOoCMo

oON

co

ON

co 4ON

CO

COo

4

©4

COo4

rH 00 O 00 CM CM CM CM ON CM f** f** On 4 4 no co m • • • cO • co co co O co 0 0 0*0 4 *4 4 4 4

O O ON O rH O O O O O

> *H E ON w co OH ON H O' On 00 ON

CO CO CO CO

r*. no s

On On On On On

CO CO CO CO CO 4 4 4 4 4 On On On On OnCO CO CO CO CO

r-* o o •4 4NO N N

o c o

4 4 4

00 00 00 GO 00 o o o o o 4 4* *4 4 >4

< D od

o o oo CM

• CM CM nO r- 4 ON On ON 4On4 8

o o o o o

CM CM CM CM 4 4 4 4

O O O O O

CM CM CM ON O' ON

CM CM

On On 0 0 0 0:0 O O O O O O O O O O o o o o o

NO NO NO 00 00

O' On 4 On O'

NO NO 00 00

O' On On On 4 4 4 4

00

O'4

4 4

O' ON 4 4

4 4 4 O' O' O' 4 4 4

CO 00 nO 00 00 .ON O' O' O' O'

ON On On On On

c

o

i/> O r- « co u ©

Z H fl • 3 M O

cu a m

Q

O

oCM o

m

o

o

ON

ON

ON

147
Table

15.

Pulse

Measurement

Data,

April

1981,

Army

EQUATE

System

DIU

BNC

#2

H

I oo w

PC 00 u o <

3 3 0

sO

I

00

I

o

3

r»* c*.

I I

I I

CM O

cn

I l

o3

CM O'

• • •H O

I I

00 sO in *o

l l

O3

M) vX>

I I

0

1 I

m pm

I I

U

3

i>r m

l

i

cn

I

oo

ro

O'm

I ro

I

O' O' O' ON O' On On O' O' O' O' O' m ro

CO O' O' O' ^

ro ro

I I

O' O' O' O' O' co 'j n m ^

n fo fo

I I l n fO (Oi I I m cn

I I fO fO n

I I cn PO (OI I I ro cn

I I co po nl l l m ml I ro ro

I I

< D 00©

CMoCMoPMo

< > o

O'ro

oo oo o o m CM CM CM O' CM

O'

co

O' <* m

sOosOo

CO CM O CO O' CM *H iH »H O' O so 00 > co O h eg 6 O' O' O' O'

v-*/ co co co co o

O'

CO

c*» c* n >o c* O' O' O' O' O'

CO CO CO CO CO

•O <0 'O *0 'O

O' O' O' O' O'

CO co CO CO co

CO CO CO o o o

CO CM o o

*0 *0

>D ^ ^ o o o o o ^ >o <

o o o <

NO so o o

*o *0

. Q ©

!*- JS

CM•o

O'o

CMO'

O'o

CM

c*O' O'

sDO'

O' O o o o o o o o o o Q /—

• • • • • © o o o O O o O o o o o o o o o o o o o

H 0 CM CM CM CM CM CM CM CM CM MO c O' O' O' O' O' CO 00 sO sO co CD co sO 00 co M* -o NO VO 00 so NO oo

S-^ O' O' O' O' O' O' O' O' O' O' O' Ov O' O' O' O' O' O' O' O' H H mO 'O *0 •o *0 O' O' O' O' O'

C/5 ©

c

0

•H r>. sO

CQ © 4-1 O Cm CM CD vD Cm Z *0 ©

3 »-> o O' o H o O'

Cm. 3 m O' o O o O' © CM m in O'

148

0.3
Table

16.

Pulse

Measurement

Data,

April

1981,

Army

EQUATE

System

DIU

BNC

#4

H<

v© vO

rH H

I I

<

I

H

00 GO

I I

00 -3

r>-

I I CM CM

I I

00 o NO NO

« m m NO NO

l l 1 1

H »wwa£> in u o < ^30

u u

:* ar

c

< D

l>

cn

I cn

l cn

I <nl mi

O' O' On On On On On On On On On On Cn On O' On O' On O' M O' O' O' O' O' oo O' in r cn cn

l I cn cn cn cn cnl l l I l cn cnl I <n cn cn

l l I cn cnl l cn cni l cn cn cn cn cnl l i i i cn cn cI I

<*©

cno

CMo

O'

oocn mO'

cn

cno-3 oO•3

cn h n r^. cn oo oo oo co H v© v* h cn on oo no cn cn cn NO O' o c^ o o o o c Z E > ^

O' O O' O' o 00 ON 00 00 ON

cn cn cn cn cn m m m m no

On O' O' O' O'

cn cn cn cn cn m m

O' on cn cn m m m On O' O' cn cn cn

cn cn o o *3 -3cn cn cn o o o

•o 3 3

V© SO C"* V© N O O O O O 3 3 3 3 3

00 00 00 c O O O C 3 3 3'

< D

O'o

I*- CM3

CMON

COO'

NO

O'3

3ON3

© o o o o

CM CM CM 3 3 3

CM CM

<3- 3

O O O O O

CM CM CM CM CM On O' ON O' ON o o o o o o o o o o o o o o o

co co ON ON

co co co On O' O'

no oo

O' ON

•3* 3

so oo oo

O' O' On 3 3 3

M 3 M < <3333 O' O' O' O' O'

00O'

O'

00 00

O' O' O' O' c

o

CO G> *H

CQ 10 U 2 H CO 3 l-i Qu 3Q

NO

O'

ON o

o

CM om

oo

ON

O'

O'

149

998.0

*iUo.u

-J

. /

wu

-z.i

-u.i

998.0

997.6

0.9

408.0

408.0

0

-3.6

-3.7

0.16

MEAN

-2.1

-0.2
Table 17A

DC voltage

SEQUENCE NUMBER

12

3

4

5

6

7

8

9

10

11

12

13

14

15

16

17

18

19

20

21

22

23

24

25

26

27

28

29

30

31

32

33

34

35

36

37

38

39

40

41

42

43

44

45

46

47

48

sequence used

DC VOLTAGE

-.500

-.100

100.000

.500

. 100

10.000

-50 .000

195.000

-100 . 000

-195.000

1 .000

-1.000

- 10 .000

50.000

-5.000

5.000

- .500

-100 .000

. 100

.500

-50.000

10 . 000

-.100

5.000

100 .000

-195.000

1.000

-5.000

- 10.000

-1 .000

195.000

50.000

- 100.000

-5.000

195.000

50.000

-50.000

.500

1 . 000

10 . 000

-1 .000

100.000

- 10 .000

-.500

-195.000

- .100

5.000

-.100

on Navy EQUATE

150
Table 17B

Low-frequency voltage sequence used on Navy EQUATE

SEQUENCE NUMBER AC VOLTAGE FREQUENCY <Hz>

1 3.000 e loo.o

2 .300 500 .

0

3 3.000 500 .

0

4 .300 5000 .

0

S .700 2000.0

6 130 .000 500 .

0

7 .700 100.0

8 130 . 000 50 .

0

9 7 . 000 10000 . 0

10 .700 50 .

0

ii .300 50 .

0

12 30.000 10000.0

13 .300 10000 . 0

14 .300 20000.0

IS 7 .000 1000.0

16 .300 1000.0

17 30 .000 50 .

0

18 7 . 000 500 .

0

19 3.000 200.0

20 30 .000 5000.0

21 130 . 000 100.0

22 70 . 000 1000 . 0 23 70 .000 10 000 . 0

24 .300 100.0

25 .300 200 .

0

26 .700 200 .

0

27 7 . 000 200 .

0

28 7.000 20000 .

0

29 .700 1000.0

30 3 .000 2000.0

31 3.000 1000.0

32 3 .000 50.0

33 130 . 000 200 .

0

34 .700 20000 .

0

35 3 . 000 5000 .

0

36 3.000 10000 . 0

37 70 .000 500 .

0

38 7 . 000 100 .

0

39 7 . 000 50000 .

0

40 .300 50000 .

0

41 .700 5000 .

0

42 .700 500 . 43 70 .000 100.0

44 130 . 000 1000.0

45 .300 2000 .

0

46 7 .000 5000 .

0

47 30.000 200 .

0

48 7 .000 2000.0

49 3.000 50000 .

0

50 70 .000 50 .

0

151
Table 17C

High-frequency voltage sequence used on Navy EQUATE

SEQUENCE NUMBER AC VOLTAGE FREQUENCY (MHz)

i 3.000 . 06

2 2.000 . 06

3 1.000 . 06

4 .500 . 06

5 .250 . 06

6 .100 .06

7 . 050 . 06

8 3.000 . 1

9 2.000 . 1

10 1 .000 . 1 11 .500 . 1 12 .250 . 1

13 .100 . 1

14 . 050 . 1 15 3.000 .2

16 2.000 .2

17 1.000 . 2

18 .500 .2

19 .250 .2

20 .100 .2

21 .050 .2

22 3.000 .5

23 2.000 .5

24 1.000 .5

25 .500 .5

26 .250 .5

27 .100 .5

28 . 050 .5

29 3.000 1 . 0

30 2.000 1 . 0 31 1.000 1.0

32 .500 1 .0

33 .250 1 . 0

34 .100 1 .0

35 . 050 1 . 0

36 3 . 000 2.0

37 2.000 2.0

38 1 .000 2.0

39 .500 2.0

40 .250 2.0

41 .100 2.0

42 .050 2.0

43 3.000 5.0

44 2.000 5.0

45 1 .000 5.0

46 .500 5.0

47 .250 5.0

48 .100 5.0

49 . 050 5.0

50 3.000 10.0

152
Table 17C (cont.

)

Si 70 .000 2000 ,, 0

52 .700 10000

,

, 0 S3 30 . 000 2000,, 0 54 30 .000 20000

,

, 0

55 70 .000 5000, 0 56 30 .000 100. 0

57 7.000 50 ,, 0 58 .700 50000

,

, 0 59 30 . 000 1000. 0

60 70 .000 200 . 0 61 30 . 000 500 , 0 62 3.000 20000. 0

153
Table 18

Sample printout of dc data, after reduction,

frow Navy EQUATE Systen

APPLIED V

4*

MEASURED U RATIO ERROR PCNT

$

-.50000 - . 49989 .99978 . 0220

-.10000 -.10016 1 .00156 - . 1560

100.00000 -99.87885 -.99879 -200 . 1213

. 50000 .49978 .99956 . 0438

.10000 . 09989 .99890 .1100

10.00000 .38007 . 03801 2531 . 0803

-50 .00000 -50 .11979 1 .00240 - . 2390

195.00000 195.05390 1 .00028 -.0276

-100 . 00000 -100.60526 1.00605 - .6016

-195 . 00000 -195.91589 1 .00470 -.4675

i .00000 .98523 .98523 1 .4996

-1 .00000 -1 .00070 1 .00070 -.0699

-10 .00000 -10 . 05379 1 .00538 -.5350

50 .00000 50.03954 1 .00079 -.0790

-5.00000 -4.99989 .99998 . 0022

5.00000 5.00008 1.00002 - . 0016

-.50000 -.49988 .99976 . 0242

-100 . 00000 -100.62125 1 .00621 -.6174

.10000 . 09987 .99872 . 1282

.50000 .49979 .99959 . 0412

-50 .00000 -50 . 12015 1.00240 -.2397

10 .00000 -2.73949 -.27395 -465.0313

-.10000 -.10017 i .00174 - . 1733

5.00000 5.00005 i .00001 - . 0009

100 .00000 -99.88494 -.99885 -200.1152

-195. 00000 -195.93347 1 .00479 -.4764

1 .00000 .99720 .99720 . 2810

-5.00000 -4.99997 .99999 .0006

-10 . 00000 -10 . 05426 1.00543 - .5397

-1 .00000 -1 .00090 1.00090 - . 0900

195.00000 195.04376 1.00022 -.0224

50 .00000 50 . 03855 1.00077 - . 0770

-100 . 00000 -100.61283 i .00613 -.6091

-5.00000 -4.99997 .99999 . 0005

195.00000 195 . 04230 1.00022 - . 0217

50 .00000 50 . 03983 1.00080 -.0796

-50 .00000 -50 . 12116 1 .00242 -.2417

.50000 .49976 .99951 . 0485

1 .00000 .98722 .98722 i .2949

10 .00000 -1.19966 -.11997 -933.5708

-1 .00000 -1 .00082 1 .00082 - . 0815

100.00000 -99.87959 -.99880 -200 . 1205

-10 .00000 -10 . 05437 1 .00544 - .5408

-.50000 -.49992 .99983 . 0168

-195.00000 -195.92321 1 .00473 -.4712

-.10000 -.10020 1 .00202 -.2011

5.00000 5.00006 1 .00001 - . 0012

-.10000 -.10018 1.00183 -.1827

154
Table 18 (cont.)

r

ii

5i 2.000 10 . 0 52 i .000 10 .

0

53 .500 10.0

54 .250 10 .

0

55 .100 10.0

56 . 050 10 . 0

i

I

155
Table 19

Sample printout of ac data, after reduction,

from Navy EQUATE System

APPLIED V MEASURED V

3.00000 2.99749321

.30000 .29962707

3.00000 2 . 99595791

.30000 .29968399

.70000 .70007627

130 .00000 129.90096283

.70000 .69853035

130 .00000 129.85685921

7.00000 7.00621760

.70000 .69894625

.30000 .29950634

30 .00000 30 .01687121

.30000 .29966037

.30000 .29881605

7.00000 7.00114870

.30000 .29959688

30 .00000 29.96718860

7 .00000 6.99205047

3.00000 2.99603948

30 .00000 30 .00501728

130 .00000 130.26374817

70 .00000 70 . 04798126

70 .00000 70 . 06575298

.30000 .29950970

.30000 .29969211

.70000 .70029834

7.00000 6.99423301

7.00000 7.04134464

.70000 .70003940

3.00000 3.00114509

3.00000 2.99892226

3.00000 2.99920934

130 .00000 129.87790489

.70000 .69875751

3.00000 3.00000489

3.00000 3.00285837

70.00000 70 . 02282143

7.00000 7.00811309

7.00000 10.81865954

.30000 .29167969

.70000 .69953442

.70000 .69892873

70 .00000 70 . 17725468

130 .00000 130 . 05159950

.30000 .29982820

7.00000 6.98962283

30 .00000 29.98130941

7.00000 6.98997414

3.00000 3.04289860

FREQUENCY PERCENT ERROR

100 . . 084

500 . . 124

500 . . 135

5000 . . 105

2000 . -.011

500 . . 076

100 . .210

50 . .110

10000

-.089

50 . . 151

50 . . 165

10000

-.056

10000 . 113

20000

. 396

1000 . -.016

1000 . . 135

50 . .109

500 . .114

200 . . 132

5000 . -.017

100 . -.202

1000 . -.068

10000

-.094

100 . . 164

200 . . 103

200 . -.043

200 . . 082

20000

-.587

1000 . -.006

2000 . -.038

1000 . . 036

50 . . 026

200 . . 094

20000 . . 178

5000 . .000

10000

-.095

500 . -.033

100 . -.116

50000 . -35.297

50000 . 2 .853

5000 . . 067

500 . . 153

100 . -,253

1000 . -.040

2000 . . 057

5000 . . 148

200 . . 062

2000 . . 143

50000 . -1 .410

156
Table 19 (cont.)

70 . 00000 69 . 94927979 50 . . 073

70 .00000 69.97371101 2000 . . 038

.70000 . 69948499 10000 . . 074

30 .00000 29.96436715 2000 . .119

30 .00000 30 . 13189340 20000 . -.438

70.00000 69.99487686 5000 . .007

30 .00000 30.00201583 100 . -.007

7.00000 6.99351937 50 . . 093

.70000 .68329054 50000 . 2.445

30 .00000 30 . 02652526 1000 . -.088

70 .00000 70.05647278 200 . - . 081

30 .00000 30.01932883 500 . - . 064

3.00000 3.01345593 20000 . -.447
Table

20.

Pulse

Measurement

Data,

July

1981,

Navy

EQUATE

System

PIU

Pins

1

and

IS,

unbuffered

Q ^

<

O'

O'

I

*H 00

l l

^ o

CM CM

I I O cn »H

CM ON

cn r-* OfH

I I

oo oo

fH O'

fH

I I

1 H

cn w

cj « C/5 2 o < 5 CJ

u

:*

sc > o

o

CMOCMO

o oo

o

o

m co ch ch cn

CM CM CM CM o o o o

o o o o

CO CO CO CO CO

CM CM CM CM o o o o O O O O

CO CO CO CO CO

rH rH iH

CM CM CM CM CM O O O O O O O O O

CO CO CO CO CO

rH »H rH rH fH

CM CM CM CM CM O O O O O

O O

cm r>» n

vo m in in m cm <r >5- <r o o o o o

o o o o o

< D > Oo

vOo o

o

o

o

oorH

<r o

vO *0

ON

oo o

o

^ m n o\

/-n cm m cm co > CO

00 N 00 vO

O' ^ O H

\fi CO N N m m m v? n

on o m co oo On On On O 00

co r* h h r^*

r** co oo m on

CM CM H CM CM O O On On

O' r>* on o CO CO CO vj CM CM CM CM CM CM CM CM CM CM

< D

v£> O

Ono

|H m ooo

CM

ON 00ON o o o o o *H O 'O O ON m m

^ 'O ^ <•

o o o o

o o o o oo o o o o o o o o o o o o o o O fH CM O H H

CM <0 CM o m

On O' O' O' O'

CM CM m rH

On On O' On

•O *0 -O

00 00 00 r* sD

oo oo co oo oo On O' O' On O' 2

OM

W H

cn <

w J a

ffl D P

2 Cu O

ON

ON o

o o

O'

O'

ON

158

V3INV3W

8000
Table

21.

Pulse

Measurement

Data,

July

1981,

Navy

EQUATE

System

PIU

Pins

1

and

IS,

buffered

I

ill Q

O' v©

>3

-

I I

CM

CM pH

I I

M3 CM

CM CM

I I O

O O

I I © cn 'J CM m m ao oo co CM o

H<

<r cm

l l CM

I l I n©ii ii

iCJ:*H

CO w

o: co id

©

:* 5

a

< D

m

o

o

m

o

oo

ONoo

o

o

l>

ON

pHoI—

I

o

cn o

CM m

•ooo

m

pH

CMo

o

2

2

>

O' On On m iTN lTN m

^ H H H

O ^H pH rH o o o o

ONm

o

On On O' On On vj lO iO lA iO O pH pH pH pH o o o o o

O O O' O -O lA l/l lA iTl vO

pH pH pH pH O'

pH pH pH pH O

O O O O

r-. r>. p". IA lA lAl lAl lAl 'O ^ *0 ^ o o o o o

o o c o o

cn fA f*i fA CO

CM CM CM CM CM o o c o o o o o o o

CMo

©

CMo

o

CM

lOl 00

N©

cn

CM CM

OV0

N©

CM

r*>* CM

UA cn pH ON o

o m v© s »j CO flD «© CM CM CM CM CM

p' Ci pH O' lA lA lA

00 CO CO CO 00

CM CM CM CM CM

p*" cn O CM «© lA A o

CM CM CM CM CM

© © ON ON CO m © m o o rCM CM CM CM CM

N O H vO H

< H O H H

r^. r»% p^ rs. p^. CM CM CM CM CM

< D

00©

'O ON CM ©

00

•o

v©

OOON

00 ©

r^. O'

v©

O'O'

I © © © © ©

rs O' h n co

r** on v© n© oo

-O *0 *0

© © © © © ^ n on n

on r* O' oo ao

O' ^ O' O' O'

© © © o ©

r- m m m

O' O' ^ O' O' © © © © ©

IA rs H A

O' O' © O' O' < >C A «J

© © o © o m v© r>* m m

O' O' O' O On

O' O' O' O' O'

I m

ca2

2OM

W H

c/3 <: © £3

ft- O

ao©

©cn

m

oON

cn © 00 © pH o

© o CM m O'

159
Table

22.

Pulse

Measurement

Data,

July

1981,

Navy

EQUATE

System

PIU

Pins

19

and

19S,

unbuffered

a

H<

m m

cm on H

I I

3 00

cm

I

r-i

• oo

vO • 3

I I

3 oo

cm

I

uu

3

H

m w

Pi w §3

< D

m

o

oo

u

3

o

oo

•H O'

so cn

I I

NO

CM

I

CM

I

CO ON cm r*

I I

00 3

CM o H H

I I

00

CM

OO

CMCMO

o

P'V 3CMO

NOo

C"> o

o

CMtO3

oo

vO co CO CO co

00 H H rH »H

CM CM CM CM CM O O O O O

o o o o o

00 nO nO CO CO

CO 00 00 H H CM CM CM CM CM o o o o o

o o o o o

00 00 CO N CO O to H in H

^ CM CM <r CM o o o o o

o o o o o

to NO LO 3 3 3 o o o o o o

CO

co3oo

r*

to3

Oo

io io to to lO 33333 o o o o o

o o o o o

< D

ONo

o

•3oo 3

o

o

o

o

CO

O'CO

NO

CO

oo

oo3ONto

CMCMCM

co

ON

COCM

H H m 00 o

O' 00 O On On

*3 CM *3 CM CO

lO tO *H ON CM

iH O O' O* H

00 00 00 00 00

v£> CM 3 O P^

On N CM 00 NO

P^ O O 00 ON H CM CM H H

On »H CO nO 3

O O' ON CM O CM CM H CM CM CM CM CM CM CM

O 00 CO On on h rv O' co

CO 3 CO CO CO

CM CM CM CM CM

< o

|H

coNA3

o o o o o

/>, CO N N H H

Q W • • • • • H C CO nO 3 nO «A w 3 3 3 3 3

0 0 0 3 0 O O O O O

P^ On CM O O On O' co on m cm

00 00 O' O' o o o o o

CM ON CM CM CM O' 00 O' O' On 3 3 3 3 3

O O O O O

00 P* On P* 00 oo oo oo oo oo On On O' O' O' Z

M 00 tO W H O CA 00 oo

c/5 <

c/5 j ai o O' O ON 0 3 3 m O' o O ON

SB Pa Q CM ON

160

00457

0

MEAN

-12.0

-

1.2
Table

23.

Pulse

Measurement

Data,

July

1981,

Navy

EQUATE

System

PIU

Pins

19

and

19S,

buffered

r

I

Q n h

H N • « <3 W on 00

I I

GO *3

CM CM

I I

sO CM

CM CM

I I

*3 m• • *H H

i i i

Q

H<

rH «3 «3

I I

GO *3- CM CM

I I

cn m

m <r

l l

00 SO 00 no so m

l l I

n h

to u o os to ^ o <

:* v

CJz u

3

< D O

O

CMO

O

CMO

o

o

l>

ON GO

•HO'oo

n*

cnO

o

f". m*3oo

o o o o o

N O N vO CM

rH lH H CO H rH O On O *H o rH O

O O O © O

co o r** on m cm on m o o

h n < m co rH O O O O o o o o o

r^r^r-r^r'*. m m m m m •3 >3 «3 <r -3 o o O o o

o o o o o

00 r>* rs m m

o m m m rH

*3 *3 *3 m CM o O O O o

o o o o o

< D o©

coooCMo

o o

COoo

o

CO

r-* sO

CM

no m

00 SO no m00m

oNO

CM CM CM CM

n* ON rH ON ON

>o m o co

no m r>. r^. no

CM CM CM CM CM

00 CM NO CO CO ON NO CM vO 00

sO vO N vO vO CM CM CM CM CM

is 00 CM H CO no n *j in oo m m m m m

CM CM CM CM CM

00 O O NO o

O' oo rs. co m m in in in

CM CM CM CM CM

rs sj h in on

O' o o o on m no >o no m

CM CM CM CM CM

< D

00o

COo

00o

*3o-3o

|H o

NO*3

*3

ON

00m

on

CM

in

On

^3

00>3

O'On O O O O O H CO *3 WO N. Q CO • • • • • h c no r>. m m m W *3 *3 *3 *3 -3

O O © O O *3 no © m n«.

rs. n* r*^ r- On On O' On On

o o o o o o o o o o

m m m in so On On O' O' O'

*3 *3 >3 <3 <3

O O O O O

wo ^3 in m m On O' On O' On On On On O* On Z

o

w M

H

OOo m cn

in m

rJ i o ON o

CO © 3 m ON o

z Oh a CM

oo

rHOm

CO

ONON

ON

161

00374

.0010

MEAN

-5.0

-0.5
Table

24.

Pulse

Measurement

Data,

July

1981,

Navy

EQUATE

System

PIU

Pins

58

and

58S,

unbuffered

m on co CO rH CM N© CO rH Q

H N m rH ON o 3 CM CM rH rH < *** rH «H

1 1 1 1 1 1 1 1 1

GO O CO CO co »n 00 «o 00 3 Q /s

CO so ON o 00 •3

* CM CO CM rH

I I I I I I I I

U H

CO w

o pc co :* o <

u o

3 o

3

< D > o

o

o

o oo

Z rH rH ON CO m M co CO CM 3 •3

* r > O O O o O

> W o o o o o

CO 00 co CO CO co 3 V© o CO CO CO m r* r^» r^* m CO CO rH rH rH rH m 00 00 V© rH m •H rH CO m m m m m m in m m

z 3 3 CM CM CM CM CM 3 CO CM CO CM 3 CM CM co 3 3 3 >3

" 3 3 3 3 3 M > o o O O o O o o o O o O o O O o o o o o o o o o o

r V-/ o o o o o O o o o o O o o o o o o o o o o o o © o

/—s. O co m CM CO

< D > rH O o *H o V/ O o o O o

l>

COCO

CM

vO CO H h*

00 CO lO CO ^

> cm in 3 co 3

rl in O N N 3 cm rH cm m

CO CO CO 00 N

O' N CM lO O v© m n© rH m CO GO ^ 00 00

r>* v© O rH On vO h* iA h in

CO »H CM CO o O H 00 N 00

lO N O CM CO^ CO^ ^

CM CM CM CM CM CM CM CM CM CM

00 CO

CM o

3

|H CO rH 00 CM 3

e • • • • • s-x •3 ON m CO 00

ON ON ON CO rH 3 ON © © o o o CO CO o CO *3 o vO v0 *3 © o o o o © o o o o o o o o o o

G vO CM CO m co r- CO 3 co ON V© N© CM 00 f"* ON m CO o ON © 00 ON oo

*** 3 *3 3 3 >3 o ON ON ON o ON ON On O' ON 00 On ON ON ON On 00 00 00 00 rH rH rH rH rH rH rH •3 *3 3 3 3 On ON ON ON ON §w 00 m

W H o r- cn 00 00

c© <; CO J 05 © On © rH ON

pa p p m ON O o ON ZI^Q CM m ON

162

i
Table

25.

Pulse

Measurement

Data,

July

1981,

Navy

EQUATt

System

PIU

Pins

58

and

58S,

buffered

|!

Q

H

<

NO CM

ca ca

l l •h ©

sO

«N CM

I I

*0- rH

I I

la m

0 o

1 i

a

H

<3

GO NO H *H

I I

CA N fO O' •HO IA *0

I I

00 <f 00 no

no la ^ II il

HO

3: HCO w

os co §3

CJ*

< D O

o o

O

o

o o

\>

X w

t! >

r>. CM CA LA LA LA NO rH <r *3

- CN CM o O o o O

o o• o o O

r*. r* r* r*** r** r- r>. CO rH ca o CA CA CA CA CA CA LA LA la LA LA LA iA LA iA LA LA LA iA m in rH rH rH NO rH rH rH rH rH *-H *0 *3

- 'O O <r -3

- *3* ^ *0 CM m CM CA CM CM CM CM CM CM O O o O o O O O o O o O O O O O o o O O O O O O o O o o o o o O o o o o o o o o o © o o o o o o O o

< D

<ro

o

r*» O

o oo o

o

o

ON

NO

CM

ON

NO

CM

00

ON

la

CM

ONLA

la

CM

NO NO LA O vO NO CA On GO NO r*. ca CM LA CM LA CA CA CA Q0 O 1^ CM CM OO 00 rH LA rH 'O nO O O 00 On On CM rH rH *0 o rH CM CM CM > NO NO N

O

NO NO r*^ NO r"» so NO NO LA LA LA NO NO NO CA NO vO NO NO NO CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM

. Q 2

' H 5

CMo

oo

lao

oo

•ao

la

ON

NO

CM

<o

ON

<r

/"S o o o o ©

a 0) LA -O 00 NO CA o o o © o o o o o o o O o o O © o

w 00 00 00 00 00 «h d rH O o LA LA NO LA nO LA LA LA rH NO LA LA

•O © o o O o On ON ON On On ON ON ON o ON ON ON rH rH rH *H rH rH rH rH rH rH •O LA sT ON ON

ssoM oo LA u H o r-* CA 00 00

CA <! • W _1 s © On O rH ON

CQ © © IA ON O o On Z Pm a CM LA ON

o o

la no

On On On On

163

995.0

995.0

0.4

2.623

2.621
Table

26.

Pulse

Measurement

Data,

July

1981,

Navy

EQUATE

System,

DIU

BNC

#1

using

various

pulse

durations

OH<

On co

I I

rH O

© o

rH ^

iA

I I

CM CM CM CM

I I

ON ON 0 o

1 l

Q ^ H GO < C

O r*

rH O

I I o o

CM GO O 00

•H

I I

00 00 d o rH rH

I I

mi

co oo

I I

IO

IX

H

C/5 W

a: to 2 <

I

< D O o

o o

*3- CMO

o

*3“ cmO

o

r*

CMO

o

2

r>. rs* CM CM <N CM CM O O O O O

o o o o o

*3- >3 *3 ^ <r

r* r*» r* r*

CM CM CM CM CM o o o o o

O O O O O

*3 *3 *3 *3 *3

r>* r^. r«* r** CM CM CM CM CM O O O O O

O O

*3 *3 *3 *3 *3

r*^ r- r>» r-* CM CM CM CM CM o o o o o

O O O O O

*3 «3 *3 *3 *3

CM CM CM CM CM o o o o o

O O O O O

< D O

o

CMO

o

COo

o

coo

o

*3

in

co

CM

ON

00

CO

CM

«3

co

co

CM

CM*H

«3

CM

ON

*3

*3

CM

*3 © 00 O On m so vo co in

CO CO co co co

*3- 00 »H O rH vO 00 H 00 CO CO *3 <f CO ^ oo vo »n m

O O nO rH CO co co co co m co cm rs

rH rH rH rH O 3 *3 *3 <3 *3

NO 00 CM ^ m

*3 m in m co

*3 *3 *3 <r CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM CM

*3 ON «3

• o o o

*3

ON

•3

00

ON

ON HON o

ON

*3 o o o o o o co cm m h

o o o On 00 No o ON ON o o o o o o o o o o o o o o o

O On On On On m *3- .3 *3 *3 O CM CM

On On On On On O' On On

*3“ *3 «3 *3 -3 H H H CM

ON ON ON O'

On On On On

C/5 CQ2

o

o

n£> r*ON

ON

CMo

0

01

00

fHO

»A

r-ON

ON

ON

orH

HCJa

i

)

I

164
Table

27.

Pulse

Measurement

Data,

July

1981,

Navy

EjUATt

System,

DIU

BNC

#1

using

various

pulse

durations

Q

H<

I

Q

H

<3 N O' O C\

I I

H

d d

•H *H

I I

NO

Pt

Hcn w o

:*

< D

O o

l> o

o

<rCMO

O

-a- >3- im Z CM CM CM CM CM H > O O O O O

T. ^ O O O O O

>

•O *0

r*. r* r>. r>» CM cm CM CM cni o o o o o

o o o o o

< D oo

COO

O'oinCM

O'CMm

CM

<T CO CO CO CO

f-l o o o o

in m m m m

CM CM CM CM CM

H n h* fN On

ro CO CM CM CM in m «n m m

CM CM CM CM CM

< D

<ro

m

o

GO

O'

00On

vOo>

ao

O'

o o o o o O O O O ON ^ O' O' 00 O' O' O' O' O' zoH

W H

co <: J «

S3 =3

P* Q

H N H• H O' CJ O' Q

O' ^

o o o o o • • • • • O' O' o o o

GO 00 O' O' O'

O' O' Cb O' O' HCM

O' u

O' Q

O' ^

165

APPENDIX A

Listing of the ATLAS program DCV, ACVL, and ACVH run

on the Army EQUATE System
C BEGIN PROGRAM TO TEST DC-CALIBR ATION OF EQUATE*

C BY T.LEEDY N.B.S. 4/21/81*

DECLARE DECIMAL, 'VDC', 'VMAX'*

DECLARE DECIMAL , 'STEP', MAXSTP', 'TPHI', 'TPLO'*

DEFINE 'LINE', RECORD " M *

E S 'LINE'*

SELECT PIU*

DISPLAY,

WAIT-FOR

II y|\

\L- \\y Jy ^ ^ ^ ^ ^ vb ^ O/ \b \b ^ ^ ^ ^ ^ U/ ^ \b ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ * THIS PROGRAM WILL MEASURE THE D.C. VOLTAGE * * AT THE P.I.U. INPUTS <TPHI> AND <TPLO> * * (ASSURE THAT THE SWITCH ON THE ADAPTER IS * * SET TO THE LF/DC POSITION)

* PRESS (PROCEED) TO CONTINUE *

* L* \b d/ \ b vly \ L/ v 1/ lb \ |y v b dy dy t b ly dy * |y \b \b \ b \L- d> d/ v ly ^ dy dy \|y i b ^ vjy \ iy ib * iy \b dy 1 L- vLy dy v L/ dy •. ly ^ \Ly ^ dy dy 1 1 yf

/|» «p /|» »p ^ /p ^ ^ ^ /p ^ /p /p /p ^ ^ ^ /p /p ^ /p »p »p /^ .* ^ ^ /p ^ )p MANUAL-INTERVENTION*

10 'LINE'*

DISPLAY, "ENTER NUMBER OF STEPS DESIRED"*

DISPLAY, "MAXIMUM NUMBER OF STEPS IS 48"*

INPUT 'MAXSTP'*

'LINE'*

RECORD, "#**** PARAMETERS OF TEST *****"*

'LINE'*

RECORD, 'MAXSTP ' , "NUMBER OF STEPS STEPS"*

20 ' STEP ' = 1*

DISPLAY, "ENTER P.I.U. PINS UNDER TEST — TPHI AND TPLO"*

INPUT 'TPHI'*

INPUT ' TPLO '

RECORD, 'TPHI', "TEST AT PIN NUMBER TPHI = * . "* RECORD, 'TPLO', "AND PIN TPLO IS NUMBER = #."*

30 CONNECT EARTH, CNX TP 128*

CONNECT EARTH, CNX TP 'TPLO'*

APPLY DC-SIGNAL DC2A , VOLTAGE SV, CNX HI 127 LO 128*

DELAY 0.01 SEC*

REMOVE DC2A*

DELAY 3 SEC*

MEASURE (VOLTAGE 'VMAX' V), DC-SIGNAL,

CNX HI 'TPHI' LO 'TPLO'*

MEASURE (VOLTAGE 'VDC' V), DC-SIGNAL, VOLTAGE MAX 'VMAX' V,

CNX HI 'TPHI' LO 'TPLO'*

RECORD 'VDC' , "MEASURED VOLTAGE IS == ***.*#**##=11=* VDC"*

COMPARE 'STEP', GT 'MAXSTP'*

GOTO STEP 40 IF GO*

'STEP' = 'STEP' 1*

GOTO STEP 30*

166
40 DISPLAY , "^ ^ ^ ^ )|( ^ j^c )j( * # )|( /^c )|( * )j( )j( * /^c )|( )|( )^( )^c )^c i|( >^c )|( )j( )|( /^c )|( * PRESS < YES > TO SELECT NEW P.I.U. PINS * * PRESS < NO > TO TERMINATE THIS PROGRAM * £ ^ ^ ^ ^ ^^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ XC )|( ^ ^ ^ ^ ^ ^ ^ ^ y|^ ^ ^ ^ ^ ^ ^ ^ ^ y^ ^ y^ ^

| | ^ WAIT-FOR MANUAL -DAT A-GO-NOGOD

GOTO STEP 20 IF GOD

PRINT, " ! P

"

$

99? TERMINATED
non BEGIN PROGRAM TO TEST AC-CALIBR ATION OF EQUATE*

IN THE LOW FREQUENCY REGION (100 HZ TO SO KHZ>$

BY T.LEEDY N.B.S. 4/21/81$

DECLARE DECIMAL, 'VAC', 'VMAX'*

DECLARE DECIMAL, 'STEP', MAXSTP ' , 'TPHI', 'TPLO'$

DEFINE 'LINE', RECORD " "*

E S 'LINE'*

SELECT PIU$

DISPLAY , ''%%%%%%%*.%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%

* THIS PROGRAM WILL MEASURE THE A.C. VOLTAGE * * AT THE P.I.U. INPUTS <TPHI> AND <TPLO> *

* (ASSURE THAT THE SWITCH ON THE ADAPTER IS %

% SET TO THE LF/DC POSITION)

* PRESS (PROCEED) TO CONTINUE *

jf ^ if. if. if if. if. if if. if if if. if. if. if if. if. 'if if. if. if. if. 'if. if if 'if 'if. if if if. if. if. if if. if if if. if. if if if if if if. if ^ WAIT-FOR MANUAL-INTERVENTION*

10 'LINE'*

DISPLAY, "ENTER NUMBER OF STEPS DESIRED"*

DISPLAY, "MAXIMUM NUMBER OF STEPS IS 63"*

INPUT 'MAXSTP'*

'LINE'*

RECORD, "***** PARAMETERS OF TEST *****"*

'LINE'*

RECORD, 'MAXSTP ' , "NUMBER OF STEPS =*. STEPS"*

20 ' STEP ' = 1*

DISPLAY, "ENTER P.I.U. PINS UNDER TEST — TPHI AND TPLO"*

INPUT 'TPHI'*

INPUT 'TPLO'*

RECORD, 'TPHI', "TEST AT PIN NUMBER TPHI = *."*

RECORD, 'TPLO', "AND PIN TPLO IS NUMBER = #."*

30 CONNECT EARTH, CNX TP 128*

CONNECT EARTH, CNX TP 'TPLO'*

APPLY DC-SIGNAL DC2A , VOLTAGE 5V , CNX HI 127 LO 128*

DELAY 0.01 SEC*

REMOVE DC2A*

DELAY 3 SEC*

MEASURE (VOLTAGE 'VMAX' V), AC-SIGNAL, FREQ 5000 HZ,

CNX HI 'TPHI' LO 'TPLO'*

MEASURE (FREQ 'FREQ' HZ), AC-SIGNAL, FREQ MAX 50000 HZ,

VOLTAGE MAX 'VMAX' V, CNX HI 'TPHI'*

MEASURE (VOLTAGE 'VAC' V), AC-SIGNAL, FREQ 'FREQ' HZ,

VOLTAGE MAX. 'VMAX' V, CNX HI 'TPHI' LO 'TPLO'*

RECORD 'FREQ' , "MEASURED FREQUENCY IS = **#.#*** HZ"*

168
RECORD >OAC>, "MEASURED VOLTAGE IS = ***.******** VAC"$

COMPARE » STEPS GT 'MAXSTP'D

GOTO STEP 40 IF GOD

^ STEP » = * STEP * + 1$

GOTO STEP 30$

40 DISPLAY , "

« L- yj ^ •. I

- . L. d» xAy ^ vjj> .jy ^ ^ ' L« |X- ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ J/ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ 'T I ' ^ ^ ^ * PRESS < YES > TO SELECT NEW P.I.U. PINS * * PRESS < NO > TO TERMINATE THIS PROGRAM * WAIT-FOR MANUAL-DATA-GO-NQGOD

GOTO STEP 20 IF GOD

PRINT, “ !P"D

E ?99 TERMINATED

169
non BEGIN PROGRAM TO TEST AC-CALIBR AT ION OF EQUATE*

IN THE HIGH-FREQUENCY REGION (60 KHZ TO 10MHZ)*

BY T . LEEDY N.B.S. 4/21/81*

DECLARE DECIMAL, >VAC>, >VMAX>*

DECLARE DECIMAL, >STEP>, MAXSTP », >TPHI>, >TPLO>*

DEFINE > LINE >

, RECORD " "*

E 5

> LINE * $

SELECT PIU*

.L O r I . . , |**| I y

*• »|' ^ »|» ^X- 'I* 'I' ^ M' t* <p ^ ^ ^ X 4* »p ^ ^ ^ ^ ^ X ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ /p x ^ ^ * THIS PROGRAM WILL MEASURE THE A.C. VOLTAGE * * AT THE P.I.U, INPUTS <TPHI> AND (TPLO) *

* (ASSURE THAT THE SWITCH ON THE ADAPTER IS * * SET TO THE HF POSITION)

* PRESS (PROCEED) TO CONTINUE *

\tf \ly \Jv 'Jj vL- ^ ^ Uv \X’ ib ib >b Ov \b \L- ib ^ vb Ob ^b uy tb \b \b b b b b b b b b b b b b b b b b b b b b b b || > ^ 4* »i» »p 4^ ^ ^ 4^ b «p /p «x» 4^ 4^ x x «p ^ x x x *p x *p ^ *p ^ ^ ^ <p ^ ^ ^ ^ /p ^ ^ ^ ^ ^ ^ 'p WAITTMFOR MANUAL-INTERVENTION*

1 0 * LINE *

DISPLAY, "ENTER NUMBER OF STEPS DESIRED"*

DISPLAY > "MAXIMUM NUMBER OF STEPS IS 56"*

INPUT > MAXSTP *

* line: > $

RECORD, "***** PARAMETERS OF TEST *****"*

> LINE* * RECORD ,

* MAXSTP > , "NUMBER OF STEPS =# . STEPS"*

20 * STEP *

1*

DISPLAY, "ENTER P.I.U. PINS UNDER TEST — TPHI AND TPLO"*

INPUT >TPHI>*

INPUT >TPLO>*

RECORD, * TPHI *

,

"TEST AT PIN NUMBER TPHI = *."*

RECORD, * TPLO * , "AND PIN TPLO IS NUMBER ~ *."*

30 CONNECT EARTH, CNX TP 128*

CONNECT EARTH, CNX TP > TP LO > * APPLY DC-SIGNAL DC2A , VOLTAGE 5V, CNX HI 127 LO 123*

DELAY 0.01 SEC*

REMOVE DC2A*

DELAY 3 SEC*

MEASURE (FREQ * FREQ > HZ), AC-SIGNAL, FREQ MAX 10. MHZ,

VOLTAGE MAX 3.5 V, CNX HI > TPHI * *

COMP A R E > F R E Q » , G T 50 0 0 0 * GOTO STEP 34 IF GO*

GOTO STEP 36 IF NOGO*

MEASURE ( VOLT AGE -T RMS >VAC* V), AC-SIGNAL, VOLTAGE-TRMS MAX 3.5 V,

FREQ MAX > FREQ > HZ, TEST-EQUIP-IMP 50 OHM,

170
CNX HI >TP H

I

>

$

MEASURE (FREQ > FREQ * HZ) , AC-SIGNAL , FREQ MAX 50000 HZ , GOTO STEP 38$

36 MEASURE (VOLTAGE >VAC> V), AC-SIGNAL , FREQ ' FREQ > HZ

,

VOLTAGE MAX 6,5 V, BUFFERED } CNX HI >TPHI>$

RECORD > FREQS "MEASURED FREQUENCY IS ~ ***.t*«* HZ"$

RECORD » VACS "MEASURED VOLTAGE IS « ***.******** VAC"$

COMPARE > STEPS GT J MAX ST P > $

GOTO STEP 40 IF GQ$

* STEP > =•• * STEP * + 1*

GOTO STEP 30$

40 DISPLAY f '

't i A $v >&? 4V nW- 4r tk "k k '•& kkk A 'M k '’M w v«f k k k in

* U» /(% #j|\ *y' 4/^ tf|I> ^i /ft* 5 At ’ wT'1 't'p * j^V -r^’i vyf' Yjf*, 'fy

1 '^1 Ap Tp-1 "Jr1 *XJ ** ' Ml*'

’ ' V A’ 1 V P “1 ’ * PRESS < YES > TO SELECT NEW P.I.U. PINS * * PRESS < NO > TO TERMINATE THIS PROGRAM *

'A/ U/ ^ vL’ U/ <V \Lf U/ ^ *jl> »,jj> ^ ijj' )1j Uv vj.* vu yfr/’ iA- \tj w • ty ^ ^ • i ; 4rV /|\ /{> rj\ /yi e r% /{v /fk 4A ‘np- "8* cf* 4^ ®5* «iv 4P ^vr* “I® M* M* % •‘IN • 1 WAIT-FOR MANUAL-DAT A~GQ~NOGO$

GOTO STEP 20 IF GO$

PRINT, " !P"$

E 999 TERMINATE*

171

APPENDIX B

Listing of the ATLAS program DCV, ACVL, and ACVH run

on the Navy EQUATE System
DECLARE DECIMAL, *VDC*, *VMAX**

DECLARE DECIMAL, * STEP * , *MAXSTP*, *TPHI*, *TPLO**

DEFINE * LINE * , RECORD " "* E 5 * LINE * $

DISPLAY, " THIS PROGRAM WILL MEASURE THE D.C. VOLTAGE

AT THE P.I.U INPUTS (TPHI) AND <TPLQ>.

PRESS (PROCEED) TO CONTINUE ... "* WAIT- FOR MANUAL-INTERVENTION*

10 * LINE * * DISPLAY, "ENTER NUMBER OF STEPS DESIRED"*

DISPLAY, "MAXIMUM NUMBER OF STEPS IS 50"*

INPUT * MAXSTP * *

* LINE* * RECORD, "*** PARAMETERS OF TEST (NAC) ***"*

* LINE* $

RECORD, * MAXSTP *

, "NUMBER OF STEPS =#. STEPS"*

20 * STEP * = i $

DISPLAY, "ENTER P.I.U. PINS UNDER TEST — TPHI AND TPLO"*

INPUT * TPHI * * INPUT * TPLO * * RECORD, * TPHI * , "TEST AT PIN NUMBER TPHI = *

. "* RECORD, * TPLO * , "TEST AT PIN NUMBER TPLO - #."*

CONNECT PIU, LOAD-IMP 0 OHM, CNX DTP 82*

CONNECT P IU , DC2-P0S ,CNX UTP 8i*

CONNECT PIU,DC2-NEG,CNX UTP 82*

SETUP DC-SIGNAL DC2, VOLTAGE 0 V*

CLOSE DC-SIGNAL DC2 * DELAY 0.5 SEC*

30 SETUP DC-SIGNAL DC2, VOLT AGE 5 V*

DELAY 1 SEC*

SETUP DC-SIGNAL DC2, VOLTAGE 0 V*

DELAY 3 SEC*

MEASURE (VOLTAGE *VMAX* V), DC-SIGNAL,

DELAY 0.3 SEC, CNX HI *TPHI* LO *TPLO**

MEASURE (VOLTAGE *VDC* V), DC-SIGNAL, VOLTAGE MAX *VMAX* V,

DELAY 0.3 SEC, CNX HI *TPHI* LO *TPLO**

RECORD * VDC * , "MEASURED VOLTAGE IS = *********** VDC"*

COMPARE * STEP *

, GT * MAXSTP**

GOTO STEP 40 IF GO*

* STEP * - * STEP * + i*

GOTO STEP 30*

40 DISPLAY, " PRESS (YES) TO SELECT NEW P.I.U. PINS

PRESS (NO) TO TERMINATE THIS PROGRAM. "* WAIT -FOR MANUAL-DATA-GO-NOGO*

GOTO STEP 20 IF GO*

PRINT " ! P "

TERMINATE*
C BEGIN PROGRAM TO TEST AC-CALIBR ATIQN OF EQUATES

C IN THE LOU FREQUENCY REGION (iOO HZ TO 50 KHZ)S

C RE-KEYED AT NAC 7/I4/8I T. LEEDYS

DECLARE DECIMAL , 'VAC', ' UMAX ' , 'FREQ'S

DECLARE DECIMAL, 'STEP', 'MAXSTP', 'TPHI', 'TPLO'S

DEFINE 'LINE', RECORD " "$

5 'LINE'S

DISPLAY, " THIS PROGRAM UILL MEASURE THE A.C. VOLTAGE

AT THE P, I. U. INPUTS (TPHI) AND <TPLO>.

PRESS (PROCEED) TO CONTINUE ... "S

WAIT -FOR MANUAL-INTERVENTIONS

E 10 'LINE'S

DISPLAY, "ENTER NUMBER OF STEPS DESIRED "$

DISPLAY, "MAXIMUM NUMBER OF STEPS IS 64 "S

INPUT ' MAX.STP 'S

'LINE'S

RECORD, "*** PARAMETERS OF TEST *** <NAC>"$

'LINE'S

RECORD, 'MAXSTP', "NUMBER OF STEPS « #. STEPS"$

20 'STEP '= IS

DISPLAY, "ENTER P.I.U. PINS UNDER TEST — TPHI AND TPLO"$

INPUT 'TPHI'S

INPUT 'TPLO'S

RECORD, 'TPHI', "TEST AT PIN NUMBER TPHI = *."$

RECORD, ' TPLO ' , "AND PIN TPLO IS NUMBER *#. "* CONNECT PIU, LOAD- IMP 0 OHM, CNX DTP 82S

CONNECT PIU, DC2-P OS , CNX UTP SIS

CONNECT P I U , DC2-NEG , CNX UTP 82S

SETUP DC-SIGNAL. DC2, VOLTAGE 0V$

CLOSE DC-SIGNAL DC2S

DELAY 0 . 5 SECS

30 SETUP DC-SIGNAL DC2, VOLTAGE 5VS

DELAY i SECS

SETUP DC-SIGNAL DC2 > VOLTAGE OVS

DELAY 2.5 SECS

MEASURE (VOLTAGE 'VMAX' V), AC-SIGNAL, VOLTAGE MAX 140 V, FREQ 100 HZ,

DELAY 0.5 SEC, CNX HI 'TPHI' LO 'TPLO'S

COMPARE ' VMAX ' , LT SOS GOTO STEP 35 IF GOS

RECORD "NO FREQ MEASUREMENT FOR > 60 VAC’S

'FREQ' « i 0 0 S GOTO STEP 37S

35 CONNECT PIU, LOAD-IMP 0 OHM, CNX UTP 'TPLO'S

MEASURE (FREQ 'FREQ' HZ), AC-SIGNAL, FREQ MAX 49.90 KHZ,

VOLTAGE MAX 'VMAX' V, DELAY 0.5 SEC, CNX HI 'TPHI'S

DISCONNECT PIU, LOAD-IMP 0 OHM, CNX UTP 'TPLO'S

37 MEASURE (VOLTAGE 'VAC' V), AC-SIGNAL , FREQ 'FREQ' HZ,

DELAY 0.5 SEC, VOLTAGE MAX 'VMAX' V, CNX HI 'TPHI' LQ 'TPLO'S

RECORD 'FREQ', "MEASURED FREQUENCY IS ** HZ” ,

' STEP ' , " STEP = t*

RECORD 'VAC', "MEASURED VOLTAGE IS #*#.*****#** VACS

COMPARE 'STEP', GT 'MAXSTP'S

GOTO STEP 40 IF GOS

'STEP' = 'STEP' + IS

GOTO STEP 30

S

40 DISPLAY, "PRESS (YES)

PRESS < NO > TO SELECT NEW P.I.U. PINS

TO TERMINATE THIS PROGRAM "$

173
WAIT-FOR MANIJAL-DAT A-GQ-NOGO$

GOTO STEP 20 IF GO*

PRINT " ! P

"

$

TERMINATE*

174
C BEGIN PROGRAM TO TEST AC-CAL.IBR AT ION OF EQUATED

C IH THE HIGH FREQUENCY REGION (SO KHZ TO 10MHZ)*

C RE-KEYED AT NAC 7/14/81 T. LEEDY*

DECLARE DECIMAL, 'VAC', 'UMAX', 'FREQ'*

DECLARE DECIMAL, ' STEP '

, 'MAXSTP', 'TPHI', 'TPLO'*

DEFINE ' LINES RECORD " "* S 'LINE'*

DISPLAY, "THIS PROGRAM IS TO MEASURE THE A.C. VOLTAGE

AT THE P.I.U. INPUT (TPHI) AND RESPECTIVE

SHIELD IN THE RANGE OF SO KHZ TO 10 MHZ.

3 VAC IS THE MAX. VOLTAGE PERMITTED

PRESS (PROCEED) TO CONTINUE

"* MAIT-FOR MANUAL-INTERVENTION*

10 ' LINE ' * DISPLAY, "ENTER THE NUMBER OF STEPS DESIRED "* DISPLAY, "THE MAXIMUM NUMBER OF STEPS IS 5d"$

INPUT ' MAXSTP ' * 'LINE '

$

RECORD, "*** PARAMETERS OF THE TEST *** (NAC)"*

'LINE'*

• RECORD, 'MAXSTP', "NUMBER OF STEPS =* . STEPS"*

20 'STEP' « 1*

DISPLAY, "ENTER P.I.U. PIN UNDER TEST — TPHI "* INPUT 'TPHI'*

RECORD, 'TPHI', "TEST AT PIN NUMBER TPHI = *

. "* CONNECT PIU, LOAD-IMP 0 OHM, CNX UTP 82*

CONNECT PIU, DC2-P0S , CNX UTP 81*

CONNECT PIU, DC2-NEG , CNX UTP 82*

SETUP DC-SIGNAL DC2, VOLTAGE 0*

CLOSE DC-SIGNAL DC2*

30 SETUP DC-SIGNAL. DC2, VOLTAGE 5V*

DELAY 0.2 SEC*

SETUP DC-SIGNAL. DC2, VOLTAGE 0V*

DELAY 2 . S SEC*

MEASURE ( VOLTAGE-TRMS 'VMAX' V) , AC-SIGNAL, VOLTAGE-TRMS MAX 3.0 V,

FREQ MAX 5 MHZ , TEST-EQUIP-IMP SO OHM , BUFFERED , CNX HI 'TPHI'*

MEASURE (FREQ 'FREQ' MHZ), AC-SIGNAL, FREQ MAX 9.9 MHZ,

VOLTAGE MAX 3.0 V, CNX HI 'TPHI'*

COMPARE 'FREQ', GT 0 . OS*

GOTO STEP 34 IF GO*

RECORD, "FREQUENCY LESS THAN SO KHZ , NO MEASUREMENT MADE"*

GOTO STEP 30 IF NOGO*

34 COMPARE 'FREQ' , GT 1 * GOTO STEP 3S IF GO*

'FREQ' =S*

35 MEASURE (VOLTAGE-TRMS 'VAC' V), AC-SIGNAL, VOLTAGE-TRMS MAX 'VMAX' V,

FREQ MAX 'FREQ' MHZ, TEST-EQUIP-IMP SO OHM, BUFFERED,

CNX HI 'TPHI'*

38 RECORD 'FREQ', "MEASURED FREQ. * **#.*# HZ", 'STEP'," STEP = *#"*

39 RECORD 'VAC', "MEASURED VOLTAGE IS = *t* . ***# VAC"*

COMPARE 'STEP' , GT 'MAXSTP'*

GOTO STEP 40 IF GO*

'STEP' * > STEP ' +1 *

175
GOTO STEP 30$

40 DISPLAY " PRESS <YES>

PRESS < NO

WAIT-FOR MANUAL-DATA-GOREMOOE ALL$

PRINT "!P M $

99 TERMINATED

TO SELECT NEW P.I.U. PINS

TO TERMINATE THIS PROGRAM

NOGO$ GOTO STEP 20 IF GO$

"$

176
APPENDIX C

Listing of the ATLAS program to acquire PIU pulse measurement data

on the Navy EQUATE System

r lUX 7/14/81 flN/USM 407 <NAFI> REV 1.00 PftGE 1

1

2

3

4

'56

C

c

10

11

12

±3

14

15

16

17

18

19

20

21

e lie

120

BEGIN PROGRAM TO MEASURE VP-MAX AND VP-MIN*

TRANSITION DURATION AND PULSE DURATION*

BV W. L. GANS*

DECLARE DECIMAL, 'DC', 'P', 'VMIN', 'VMAX', ' VM I NM ' , ' VMAXM '

,

' MH I TP ' , 'MLOTP', 'THRESHOLD', 'NINE', 'TEN', 'PDPN', 'TR',

' VM I NB ' , ' VMAXB ' , 'THRESHB', 'NINEB', ' TENB '

DEFINE 'LINE', RECORD, " "* DISPLAY, "+ .+ +; !+: + jf: + >»: +. **4: >f: :+: ;+; }|c if >f. * if :+: * THIS PROGRAM WILL MEASURE VOLTAGE-P-MAX, * VOLTAGE—P—MIN, PULSE TRANSITION DURATION, * * AND PULSE DURATION THRU THE PIU ABOVE *

* 50 KHZ AND INTO THE 50 OHM LOAD. *

* PRESS PROCEED TO CONTINUE OR PRESS

* HALT TO TERMINATE. *

if sf :+c :+< Jf; .+: if: :+: + :f *if: if jfc if :f if +: :f if if if if :f sf >f jf :f :f sf sf :f sf sf sf sf " $

WA I T-FOR MANUAL- I NTERVENT I ON*

REMOVE ALL*

24

25

26

27

28

•r,Q 3'0

31

34

D I SPLAY, " ENTER DUTY-CYCLE "

INPUT 'DC'*

RECORD 'DC', "DUTY-CYCLE = ##. # X"*

DISPLAY, "ENTER VOLTAGE-MAX"*

INPUT 'VMAX'*

RECORD 'VMAX', "VOLTAGE-MAX = #. ## VDC"*

DISPLAY, "ENTER VOLTAGE—M I N "

INPUT 'VMIN'*

RECORD 'VMIN', " VOLTAGE-MI N = #. ## VDC"*

DISPLAY, "ENTER PERIOD IN USEC"*

INPUT 'R E- RECORD 'P', "PERIOD = #. ## USEC"*

40

41

42

43

44

45

46

47

48

49

50

51

130 DISPLAY, "ENTER MEAS. HI TEST POINT"*

INPUT ' MH I TP '

RECORD ' MH I TP ' , "MEAS. HI TEST POINT = ####"*

'LINE'*

MEASURE < VOLTAGE-P-MAX 'VMAXM' V>, PULSED-DC,

VOLTAGE MAX 'VMAX' V, PERIOD 'P' USEC, DUTY-CYCLE 'DC' PC,

TEST-EQU I P— I MP 50 OHM, CNX HI ' MH I TP '

'LINE'*

53

54

55

56

57

58

RECORD 'VMAXM', "VOLTAGE-P-MAX < UNBUFF > = ####. ##### V"*

'LINE'*

CONNECT PIU, LOAD- IMP 50 OHM, CNX UTP 'MHITP'*

DELAY 0. 5 SEC*

177
PIUX 7/14/81 RN/USM 407 <NRFI> REV 1.00 PfiGE 2

59

60

61

62

63

64

65

66

67

68

69

70

71

72

73

74

75

76

77

78

79

80

81

82

83

84

85

86

87

88

89

90

91

92

93

94

95

96

97

98

99

100

101

102

103

104

185

106

107

108

109

110

111

112

113

114

115

116

MERSURE < VOLTRGE-P-MRX 'VMRXB' V>, PULSED-DC,

V0LTRGE MRX 'VMRX' V, PERIOD 'P' USEC, DUTY-CYCLE 'DC' PC,

BUFFERED, CNX HI 'MHITP'S

RECORD 'VMRXB', " VOLTRGE-P-MRX <BUFF> = ####. ##### V"S

DISCONNECT PIU, LORD- IMP 50 OHM, CNX UTP 'MHITP'S

'LINE'S

MERSURE < VOLTRGE-P-M I N ' VM I NM ' V), PULSED-DC,

VOLTRGE MRX 'VMRX' V, PERIOD 'P' USEC, DUTV-CVCLE 'DC' PC,

TEST-EQUIP-IMP 50 OHM, CNX HI 'MHITP'S

'LINE'S

RECORD ' VM I NM ' , " VOLTRGE-P-M I N < UNBUFF > = ####. ##### V"S

'LINE'S

CONNECT PIU, LORD-IMP 50 OHM, CNX UTP 'MHITP'S

DELRY 0. 5 SECS

MERSURE < VOLTRGE-P-M IN ' VM I NB ' V>, PULSED-DC,

VOLTRGE MRX 'VMRX' V, PERIOD 'P' USEC, DUTY-CYCLE 'DC' PC,

BUFFERED, CNX HI 'MHITP'S

'LINE'S

DISCONNECT PIU, LORD- IMP 50 OHM, CNX UTP 'MHITP'S

RECORD ' VMINB', "VOLTRGE-P-M IN <BUFF> = ####. ##### V"S

'LINE'S

' THRESHOLD '= C'VMINM' + 'VMRXM'>/2S

RECORD 'THRESHOLD', "THRESHOLD < UNBUFF > = ####. ##### V"S

'LINE'S

'THRESHB'= < 'VMINB' + 'VMRXBO/2S

RECORD 'THRESHB', "THRESHOLD CBUFF> = ####. ##### V"S

'LINE'S

' N I NE ' = ' VM I NM ' + 0. 9*=RBS<'VMRXM' - 'VMINM'>S

RECORD 'NINE', "NINETY < UNBUFF > = ####. ##### VS

'LINE'S

'NINEB' = ' VMINB' + 0. 9*RBS< 'VMRXB' - 'VMINB'>S

RECORD 'NINEB', "NINETY <BUFF> = ####. ##### VS

'LINE'S

' TEN ' = ' VM I NM ' + 0. 1*RBSC'VMRXM' - 'VMINM')S

RECORD 'TEN', "TEN < UNBUFF > = ####. ##### V"S

'LINE'S

'TENB' = ' VMINB' + 0. 1*RBS< 'VMRXB' - 'VMINB' >S

RECORD 'TENB', "TEN <BUFF> = ####. ##### V"S

178
»IUX 7/14/81 ftN/USM 407 <NRFI > REV 1.00 PRGE 3

118 . 119 ;

-i] • 12.1 : 1/2

;

123

124 : 125

;

126 : 12? • SEC'“*

128

:

129:

138:

131:

132

:

133:

134:

135

:

136

137:

138 : 139

:

140:

EC"*

141:

142:

143:

144:

145 : 146:

147:

148

:

149:

158

:

151:

152 : 153 : 154:

155:

156:

157:

158

:

159

160

:

161:

162:

163:

164:

165

:

166 : 167:

168:

169

:

170:

171:

172

173:

174:

BEGIN TINE- INTERVAL MEASUREMENT PROGRAM*

MEASURE CTIME ' TR" NSEC >, TIME- INTERVAL, SINGLE-CHANNEL,

MAX-TIME 1 SEC, START, VOLTAGE MAX "VMAX" V,

THRESHOLD 'TEN'' V, POS-SLOPE, TEST-EQUIP-IMP 50 OHM,

CNX HI "MHITP", STOP, THRESHOLD "NINE" V, POS-SLOPE*

'LINE'*

RECORD "TR", "FIRST TRANSITION DURATION < UNBUFF > = ####. ####*

'LINE'*

CONNECT Pill, LOAD- IMP 50 OHM, CNX UTP "MHITP"*

DELAV 0. 5 SEC*

MEASURE CTIME "TR'' NSEC >, TIME- INTERVAL, SINGLE-CHANNEL,

MAX-TIME 1 SEC, BUFFERED, START, VOLTAGE MAX ' VMAX " V,

THRESHOLD " TENS " V, POS-SLOPE,

CNX HI "MHITP", STOP, THRESHOLD "NINES" V, POS-SLOPE*

'LINE'*

DISCONNECT P I U, LOAD- IMP 50 OHM, CNX UTP "MHITP'*

RECORD 'TR', "FIRST TRANSITION DURATION <BUFF> = ####. ##### NS

"LINE'*

MEASURE CTIME "PDPN" NSEO, TIME- INTERVAL, SINGLE-CHANNEL,

MAX-TIME 1 SEC, START, VOLTAGE MAX "VMAX" V,

THRESHOLD "THRESHOLD" V, POS-SLOPE, TEST-EQUIP-IMP 50 OHM

CNX HI "MHITP", STOP, THRESHOLD "THRESHOLD" V, NEG-SLOPE*

"LINE"*

RECORD "PDPN", "PULSE DURATION < UNBUFF > = ####. ##### NSEC !# * "LINE"*

CONNECT P I U, LOAD- IMP 50 OHM, CNX UTP "MHITP"*

DELAV 0. 5 SEC*

MEASURE C T I ME " PDPN " NSEC > , T I ME- 1 NTERVAL, S I NGLE-CHANNEL,

MAX-TIME 1 SEC, BUFFERED, START, VOLTAGE MAX "VMAX" V,

THRESHOLD "THRESHB" V, POS-SLOPE, CNX HI "MHITP",

STOP, THRESHOLD "THRESHB" V, NEG-SLOPE*

"LINE"*

DISCONNECT P I U, LOAD- IMP 50 OHM, CNX UTP "MHITP"*

RECORD "PDPN", "PULSE DURATION CBUFF> = ####. ##### NSEC"$

PRINT "V*

DISPLAV"

PRESS VES T0 RERUN PROGRAM

PRESS NO TO TERMINATE"*

WAI T-FOR MANUAL-DATA-GO—NOGO*

GOTO STEP 110 IF GO*

GOTO STEP 99999 IF NOGO*

179
PIUX 7/14/81 RN/USM 407 <NRFI> REV 1.00 PfiGE 4

175: 93339 REMOVE RLL*

176: TERMINRTE*

180
APPENDIX D

A typical pulse measurement printout from the PIU tests

CYCLE = 1. 0

GE-MAX = 2. 50 VDC

AGE- MIN = 0. 00 VDC

i 10. 00 USEC.

H3 TEST POINT = 1

VOLTAGE—P -MAX < UNBUFF > = 1. 71565 V

VOLTAGE-P-MAX <BUFF> = 2. 85253 V

VOLTAGE-P-MIN < UNBUFF > = 0. 00213 V

VOLTAGE-P-MIN <BUFF> = O. 81159 V

THRESHOLD < UNBUFF > = 8. 85889 V

THRESHOLD <BUFF> = 1. 43206 V

NINETY C UNBUFF > = 1. 54429 V

NINETY < BUFF > = 2. 56843 V

TEN C UNBUFF > = 8. 17348 V

TEN < BUFF ) = 0. 29569 V

FIRST TRANSITION DURATION < UNBUFF > = 9740, 00080 NSEC

FIRST TRANSITION DURATION <6UFF> = 9740. 00000 NSEC

PULSE DURATION < UNBUFF > = 112. 08008 NSEC

PULSE DURATION <BUFF> = 98. 89999 NSEC

181

APPENDIX E

Listing of the ATLAS program to acquire DIU pulse measurement data

on the Navy EQUATE System
PIUV 7/16/81 fiN/USM 487 <NAFI> REV 1.00 PRGE 1

1

2

3

4

5

6

7

8

9

10

11

12

13

14

15

16

17

18

19

20

21

22

23

24

25

26

C

C

C

E 110

120

BEGIN PROGRRM TO MEASURE VP-MRX RND VP-MINS

TRANSITION DURATION AND PULSE DURATIONS

BV W. L. GANSS

DECLARE DECIMAL, 'DC', 'P', 'VMIN', 'VMAX', 'VMINM', ' VMAXM '

,

'MHITP', 'MLOTP', 'THRESHOLD', 'NINE', 'TEN', 'PDPN', 'TR'S

DEFINE 'LINE', RECORD, " "S

DISPLAY,

* THIS PROGRAM WILL MEASURE VOLTAGE-P-MAX, *

* VOLTAGE-P-MIN, PULSE TRANSITION DURATION, * * AND PULSE DURATION THRU THE DIU ABOVE * * 50 KHZ AND INTO THE 50 OHM LOAD. *

* PRESS PROCEED TO CONTINUE OR PRESS *

* HALT TO TERMINATE. *

WA I T-FOR MANUAL- I NTERVENT I ONS

REMOVE ALLS

DISPLAY, "ENTER DUTY-CYCLE "S

INPUT 'DC'S

RECORD 'DC', "DUTY-CYCLE = ##. # X"S

28

29

30

31

32

33

34

35

36

37

38

39

40

41

42

43

44

45

46

47

48

49

50

51

52

53

54

55

56

57

DISPLAY, "ENTER VOLTAGE-MAX "S

INPUT 'VMAX'S

RECORD ' VMAX ' , "VOLTAGE-MAX = #. ## VDC"S

DISPLAY, "ENTER VOLTAGE-M I N "

S

INPUT ' VM IN'S

RECORD ' VM IN', "VOLTAGE-M IN = #. ## VDC"S

DISPLAY, "ENTER PERIOD IN USEC"S

INPUT 'P'S

RECORD 'P', "PERIOD = #. ## USECS

'LINE'S

MEASURE C VOLTAGE-P-MAX 'VMAXM' V>, PULSED-DC,

VOLTAGE MAX 'VMAX' V, PERIOD 'P' USEC, DUTY-CYCLE 'DC' PC,

TEST-EQUIP-IMP 50 OHM, CNX BNC IS

'LINE'S

RECORD 'VMAXM', "VOLTAGE-P-MAX = ####. #####"

S

'LINE'S

MEASURE < VOLTAGE-P-MIN ' VM I NM ' V>, PULSED-DC,

VOLTAGE MAX 'VMAX' V, PERIOD 'P' USEC, DUTY-CYCLE 'DC' PC,

TEST-EQUIP-IMP 50 OHM, CNX BNC IS

'LINE'S

182
F SUV 7/16/81 RN/USH 487 <NftFI> REV 1.88 F’RGE 2

C-.

;

v'„ 68

61

62

S3

64

65

66

67

68

69

78

71

74

75

76

C

RECORD ' VM I NM ' , " VOLTAGE-P-M I N = ####. ##### VI

'LINE'*

' THRESHOLD '= C'VMINM' + 'VMAXMO/2*

RECORD 'THRESHOLD', "THRESHOLD = ####. ##### V"*

'LINE'*

' N I NE ' = ' VM I NM ' +8. 9*ABS < ' VMAXM ' - ' VM I NM ' > * RECORD 'NINE', "NINETY = ####. ##### V"*

'LINE'*

X TEN' = ' VM I NM ' +8. 1*RBS <

' VMRXM ' - ' VM I NM ' > * RECORD 'TEN', "TEN = ####. ##### V"*

'LINE'*

BEGIN TIME- INTERVAL MEASUREMENT PROGRAM*

MEASURE < T I ME ' TR ' NSEC >, TIME- 1 NTERVAL, S I NGLE-CHRNNEL

MAX-TIME 1 SEC, START, VOLTAGE MAX 'VMAX' V,

THRESHOLD 'TEN' V, POS-SLOPE, TEST-EQU IP- IMP 58 OHM,

CNX BNC 1, STOP, THRESHOLD 'NINE' V, POS-SLOPE*

'LINE'*

RECORD 'TR', "FIRST TRANSITION DURATION = #### ##### NSEC

'LINE'*

84

85

86

87

89

98

91

MEASURE < T I ME ' PDPN ' NSEC > , T I ME- 1 NTERVAL, S I NGLE-CHANNEL,

MAX-TIME 1 SEC, START, VOLTAGE MAX 'VMAX' V,

THRESHOLD 'THRESHOLD' V, POS-SLOPE, TEST-EQUIP-IMP 5© OHM,

CNX BNC i, STOP, THRESHOLD 'THRESHOLD' V, NEG-SLOPE*

'LINE'*

RECORD ' PDPN ' , "PULSE DURATION = ####. ##### NSEC"*

'LINE'*

9<

94

95

96

98

:

99 : 188

:

181

:

99999

DISPLAY"

PRESS YES T8 RERUN PROGRAM

PRESS NO TO TERMINATE"*

WA I T-FOR flANURL-DATA-GO-NOGO*

GOTO STEP 118 IF GO*

GOTO STEP 99999 IF NOGO*

REMOVE ALL*

TERMINATE*

183

APPENDIX F

A typical pulse measurement printout from the DID tests
DUTY-CYCLE = 0. 5

VOLTfiGE-MflX = 2. 50 VDC

VOLTAGE-MIN 0. 00 VDC

PERIOD = 10. 00 USEC

VOLTAGE-P-MAX = 2. 35426

VOLTAGE-P-M I N = 0. 00274 V

THRESHOLD = 1. 17850 V

NINETY = 2. 11911 V

TEN = 0. 22789 V

FIRST TRANSITION DURATION = 10004. 00000 NSEC

PULSE DURATION = 49. 99999 NSEC

184
NBS-114A 1REV- 2-BC) U.S. DEPT. OF COMM.

BIBLIOGRAPHIC DATA

SHEET (See instructions)

1. PUBLICATION OR

REPORT NO.

ilk h2

??

1

2. Performing Organ. Report No. 3. Publication Date

December 1982 —i

4. TITLE AND SUBTITLE

AUTOMATIC TEST EQUIPMENT CALIBRATION/PERFORMANCE

VERIFICATION EVALUATION AND RESEARCH PROGRAM

( JLC/DoD Subtask 30702) PART II

5. author(S) Thomas F. Robert E. -— —

Leedy, William L. Gans, Barry A. Bell, Paul S. Lederer,

Nel son

t. PERFORMING ORGANIZATION (If joint or other than NBS. see instructions)

national bureau of standards

DEPARTMENT OF COMMERCE

WASHINGTON, D.C. 20234

7. Contract/Grant No.

8. Type of Report & Period Cove

Final

9.

SPONSORING ORGANIZATION NAME AND COMPLETE ADDRESS (Street. City. State. ZIP)

Prepared for

Joint Logistics Commanders Panel on Automatic Testing

DoD Joint Technical Coordination Group for Metrology

)oD Calibration Coordination Group

USAF ASD/AEGB Mate Program Office •

10.

SUPPLEMENTARY NOTES

~] Document describes a computer program; SF-185, FIPS Software Summary, is attached.

11.

ABSTRACT (A 200-word or less factual summary of most significant information. If document includes a significant

bibliography or literature survey, mention it here)

This work describes an experimental approach to verify the

performance of selected third generation automatic test systems.

The approach consisted of careful laboratory character! zation

of two types of signal sources. One was a dc and low frequency

ac voltage source covering the range of approximately 100 mV to

200 V dc, and 300 mV to 1 40 V ac rms over a frequency range of

100 Hz to 10 MHz. The second source was a precision time

synthesizer used to generate pulses of known durations from 50 to

1000 ns. Both of these sources were used to verify the ability of

two automatic test systems to measure ac and dc voltages and time

intervals. The methods used to characterize these sources and the

measurement results of applying the sources to the two automatic

test systems are discussed in detail. Recommendations for future

efforts to improve the measurement capabilities and traceability of

automatic test systems are also presented.

12.

KEY WORDS (Six to twelve entries; alphabetical order; capitalize only proper names; and separate key words by if :o' :<r.s) ATE; automatic test systems; calibration; characterization; dynamic transport

standard; evaluation; field calibration; performance test; tnird generation systi;

13.

AVAILABILITY

ET] Unlimited

[X] For Official Distribution. Do Not Release to NTIS

Order From Superintendent of Documents. U.S. Government Printing Office, Washington, D.C.

20402.

| | Order From National Technical Information Service (NTIS), Springfield, VA. 22161

14. NO. OF

PRINTED PAGES 5

15. Price

USCOMM-DC 804'3-P -so


I

I

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t

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