AlllDb 3 fi fi 7

Center for Electronics and

Electrical Engineering

Technical

Publication

Announcements

Ll

Covering Center Programs,

July - September 1984 with

1985 CEEE Events Calendar

March 1985

U.S. Department of Commerce

National Bureau of Standards

National Engineering Laboratory

Gaithersburg, Maryland 20899

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NBSIR 85-3106

Center for Electronics and

Electrical Engineering

Technical

Publication

Announcements

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*

Covering Center Programs,

July - September 1984 with

1985 CEEE Events Calendar

March 1985

U.S. Department of Commerce

National Bureau of Standards

National Engineering Laboratory

Gaithersburg, Maryland 20899

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N

INTRODUCTION TO MARCH 1985 ISSUE OF THE CEEE TECHNICAL PUBLICATION ANNOUNCEMENTS

This is the second edition of a quarterly abstract journal covering the work of the

National Bureau of Standards Center for Electronics and Electrical Engineering. This

issue of the CEEE Technical Publication Announcements covers the third quarter of

calendar year 1984.

Organization of Announcements : This issue contains citations and abstracts for

Center papers published in the quarter. Entries are arranged by technical topic as identified in the table of contents and alphabetically by first author under each

subheading within each topic. Following each abstract is the telephone number of the

individual to contact for more information on the topic; unless otherwise noted,

this person is the first author. This issue also includes a calendar of Center

conferences and workshops planned for calendar year 1985, an announcement of newly

released standard reference materials, and a list of sponsors of the work.

Center for Electronics and Electrical Engineering : Center programs provide national

reference standards, measurement methods, supporting theory and data, and

traceability to national standards.

The metrological products of these programs aid economic growth by promoting equity

and efficiency in the marketplace, by removing metrological barriers to improved

productivity and innovation, by increasing U. S. competitiveness in international

markets through facilitation of compliance with international agreements, and by

providing technical bases for the development of voluntary standards for domestic and

international trade. These metrological products also aid in the development of

rational regulatory policy and promote efficient functioning of technical programs of

the Government.

The work of the Center is divided into two major programs: the Semiconductor

Technology Program, carried out by the Semiconductor Materials and Processes and

Semiconductor Devices and Circuits Divisions in Gaithersburg, MD, and the Signals and

Systems Metrology Program, carried out by the Electrosystems Division in Gaithersburg

and the Electromagnetic Fields and Electromagnetic Technology Divisions in Boulder,

CO. Key contacts in the Center are given on the back cover; readers are encouraged

to contact any of these individuals for further information.

Center sponsors : The Center Programs are sponsored by the National Bureau of

Standards and a number of other organizations, in both the Federal and private

sectors; these are identified on pages 7 and 8.

Note on Publication Lists : Guides to earlier as well as recent work are the

publication lists covering the work of each division. These lists are revised and

reissued on an approximately annual basis and are available from the originating

division [publications from the Semiconductor Technology Program are covered in a single list, available from either Semiconductor Division].
CEEE Technical Publication Announcements - March 85 Page 1 TABLE OF CONTENTS

INTRODUCTION inside front cover

SEMICONDUCTOR TECHNOLOGY PROGRAM

Silicon Materials 2 Integrated Circuit Test Structures 2 Packaging 2 Other Semiconductor Metrology 3

SIGNALS AND SYSTEMS METROLOGY PROGRAM

FAST SIGNAL ACQUISITION, PROCESSING, & TRANSMISSION 3 Noise Metrology 3 Microwave and Millimeter-Wave Metrology 3 Other Fast Signal Topics 4

ELECTRICAL SYSTEMS 4

Power Systems Metrology 4

Magnetic Materials and Measurements 4

Superconductors 5

ELECTROMAGNETIC INTERFERENCE 6

CEEE CALENDAR 6

NEW STANDARD REFERENCE MATERIALS 7 SPONSOR LIST 7 KEY CONTACTS IN CENTER, CENTER ORGANIZATION back cover
Page 2 CEEE Technical Publication Announcements March 85

SEMICONDUCTOR TECHNOLOGY PROGRAM

Silicon Ma t e r i a 1 s Larrabee R.D., Ed., Neutron

Transmutation Doping of Semiconductor Materials, Proc. 4th Neutron

Transmutation Doping Conference, June

2-3, 1982, Plenum Press, NY (1984).

This volume contains the papers

presented at the Fourth International

Neutron Transmutation Doping Conference

held at the National Bureau of Standards

in Gaithersburg, Maryland on June 1-3,

1 982 . The Fourth International*

Transmutation Doping Conference reported

in this volume includes invited papers summarizing the present and anticipated

future of NTD silicon, the processing

and characterization of NTD silicon, and

the use of NTD silicon in semiconductor

power devices. In addition, four papers were presented on NTD of nonsilicon

semiconductors, five papers on

irradiation technology, three papers on practical utilization of NTD silicon,

four papers on the characterization of

NTD silicon, and five papers on neutron

damage and annealing. These papers indicate that irradiation technology for

NTD silicon and its use by the power- device industry are approaching

maturity.

1(301) 921-3786]

Integrated Circuit Test Structure!

Mazer > J.A. and Linholra, L.W., Comments on "Determining Specific

Contact Resistivity from Contact End Resistance Measurements", IEEE

Electron Devices Letters, EDL-5 dd

347-348 (September 1984).

Comments are rendered on the application

of the transmission-line model (TLM) to

the determination of specific contact

resistance by Chern and Oldham in a recent letter appearing in this journal. Comments are also made on those authors'

interpretation of related work by

Proctor and Linholra. It is shown that

Chern and Oldham have misinterpreted

some of the results of Proctor and

Linholm and have failed to recognize

certain critical assumptions that

underlie the TLM.

[(301) 921-3621]

Schafft, H. A. , Younkins, C.D., Grant,

T.C., Kao, C.-Y. , and Saxena, A.N.,

Effect of Passivation and Passivation

Defects on Electromigration Failure in

Aluminum Metallization, 22nd Annual

Proceedings, Reliability Physics 1984,

Las Vegas, NV, pp. 250-255 (April 3-5,

1984).

Metal line structures with intentional

defects in the passivation, to simulate

cracks or pin holes, were used in electromigration studies. Results show that

the stress changes in the metallization

caused by these defects are not as important as the restraining action of the

passivation in affecting a metallization 8 resistance to electromigration

failure. Also, the observed effects of

restorative forces acting on the metallization suggests that continuous monitoring for open-circuit failure may be

necessary to obtain an accurate measure

of the mean— time— to— fa i lure

[(301) 921-3621]

Packaging

Moore, B.A. and Ruthberg, S. , RADC/NBS

Workshop - Moisture Measurement and

Control for Semiconductor Devices

III, NBSIR 84-2852 (May 1984).

The workshop, one of a series concerned

with measurement problems in integrated

circuit processing and assembly, served

as a forum to examine the continuing

progress that has been made in the

measurement and control of moisture in

hermetically packaged semiconductor

devices. Thirty-four presentations are included which contain detailed

information for securing hermetic

packages with low moisture content.

Agreement in measurement has been

obtained with the mass spectrometer for

cerdip and metal packages at the 5000

ppmv level of moisture through the use
CEEE Technical Publication Announcements - March 85 Page 3

Packaging , cont'd.

of suitable moisture generators, a 3-

volume calibrator, calibrated dewpoint

hygrometers, and appropriate operational

procedures. An approach is given for a reproducible and reliable transfer package. However, the increased use of organic materials in new and rapidly ex- panding technologies such as VLSI/VHSIC

and hybrid packaging presents new and more complex challenges to accurate

measurement of interior moisture.

[Contact: Ruthberg (301) 921-3625]

Other Semiconductor Metrology

Forman, R.A. and Kratz, H. D. , A Simple

Vacuum Pump Exhaust Filter, Rev. Sci.

Instrum., 55, p. 1503 (Sept. 1984).

A simple high throughput, exhaust filter

for oil-filled mechanical vacuum pumps

is described. The design allows easy

connection to external systems. Inexpensive filter elements, available anywhere, are a further feature of the

system. [(301) 921-3625]

Hinkley, J.A., Adsorption of

Polystyrene on Thermally Oxidized

Silicon, Polymer Preprints, 25, pp.

178-179 (Apri 1 1984).

Ellipsometry was used to observe the

adsorption, from theta solvents, of

polystyrene on thermally oxidized

silicon. Since no adsorption was seen with a polar solvent, it is concluded

that specific acid-base interactions are decisive in adsorption. At high surface

coverages, the present results agree

with those on various metal surfaces,

and the root-raean-square extension of

polymer coils from the surface is almost

twice the radius of gyration of a chain

in solution.

[Contact: G.P. Carver, (301) 921-3786]

FAST SIGNAL ACQUISITION, PROCESSING,

AND TRANSMISSION

Noise Metrology

Miller, C.K.S. and Daywitt, W.C., The

NBS Switching Radiometers, NBSIR 84-

3004.

An error analysis for the Dicke

radiometers used by the National Bureau

of Standards (NBS) in their WR90 and

WR62 waveguide noise calibration

services for sources with noise

temperatures above 1000 kelvin is

discussed. A list of measurement

frequencies currently available in the

WR90 and WR62 bands is presented.

[(303) 497-3131]

Miller, C.K.S. and Daywitt, W.C., The

NBS WR62 and WR90 Reference Noise

Standards, NBSIR 84-3005.

The basis for the National Bureau of

Standards (NBS) WR90 and WR62 Waveguide

Reference Noise Standards and the

corresponding error analyses are

described. The standards are heated

(1270 K) thermal noise generators, and a derivation of their output noise

temperature equations is also presented.

Results of comparisons of the NBS WR90

standard with those of Sweden, England,

Australia, and Japan are included. The

text is extracted from course notes

presented at NBS in 1970, and hence does

not include descriptions of standards

constructed at NBS since that time.

[(303) 497-3131]

Microwave and Millimeter-Wave Metrology

Judish, R.M. and Jones, R.N., A

Generalized Method for the Calibration

of Four-Terminal-Pair Type Digital

Impedance Meters, NBSIR 84-3016

(August 1984).

Since the introduction of automated,

f our- te rrai na 1 , pair-type impedance

meters, there has been a continuing

interest in the development of

calibration techniques which would

satisfactorily verify the accuracy

capabilities of these instrument*.

Various attempts have been made and all

have helped to provide a certain degree

of confidence in instrument performance,
Page 4 CEEE Technical Publication Announcements - March 85

Microwave and Millimeter-Wave , cont'd.

but until now, a generalized approach

with a good mathematical and statistical

background has been lacking. This paper

describes a calibration procedure having

such a background and illustrates its use. The calibration is accomplished

through the use of impedance standards

which relate instrument readings to the

values of the standards through a known

functional relationship. The

calibration procedure described

estimates the parameters associated with

the functional relationship and requires

the use of a computer. Calibration is

accomplished at the reference plane of

the impedance standards and any adapter

required to connect the standards to the

instrument is assumed to be an integral

part of the impedance meter.

[(303) 497-3380]

Other Fast Signal Topics

Kamper, R . A . and Kline, K.E.,

Metrology for Electromagnetic

Technology: A Bibliography of NBS

Publications, NBSIR 84-3014 (July

1984).

This bibliography lists the publications

of the personnel of the Electromagnetic

Technology Division of NBS in the period

from January 1970 through December 1983.

A few earlier references that are directly related to the present work of

the Division are included.

[(303) 497-3535]

ELECTRICAL SYSTEMS

Power Systems Metrology

Fulcomer, P.M. , Calibration Check of

Bonneville Power Administration 60-Hz

Electric Field Exposure Monitor and

Measurement of Its Surface Field

Enhancement for Various Uniform and

Nonuniform Operating Configurations,

NBSIR 84-2885.

This report presents the results of

tests requested by the Bonneville Power

Administration (BPA) on a 60-Hz Electric

Field Exposure Monitor (EFEM) developed

by their Instrumentation and Standards

Branch. The unit is designed to be worn

on the body, such as in a shirt pocket

or attached to the clothing. The

calibration of two sample units is

examined, information on surface field

enhancement (which results from the EFEM

sensors' elevated position relative to

the surface of the body) is presented,

the effect of material covering the

sensor is specified, and the

applicability of calibration and

operational information obtained in

uniform fields to nonuniform fields is

investigated.

[(301) 921-3121]

Hebner, R.E., Development of Power

System Measurements — Quarterly Report

January 1, 1984 to March 31, 1984,

NBSIR 84-2898.

This report documents the progress on three technical investigations sponsored

by the Department of Energy and

performed by the Elec trosys terns

Division, the National Bureau of

Standards. The work described covers

the period from January 1, 1984 to March

31, 1984. The report emphasizes the

performance of ion counters like those

used to measure the ions near dc

transmission lines, the production rates

of oxyfluorides in SF 5 corona

discharges, and the measurement of space

charge associated with a pressboard

interface in transformer oil.

[(301) 921-3121]

Magnetic Materials and Measurements

Fickett, F.R., The Effect of Mill

Temper on the Mechanical and

Magnetoresiative Properties of OxygenFree Copper in Liquid Helium,

Advances in Cryogenic Engineering

Materials, Vol . 30, pp. 453-460

(July 1984).

Depending on the source of the ore and

its subsequent processing, oxygen-free

copper can show wide variations in low
CEEE Technical Publication Announcements - March 85 Page 5

Magnetic Materials and Meas. , cont'd.

temperature mechanical and electrical

properties. Further mechanical and

thermal processing by the wire producer

and final user will also affect the

behavior of the copper as a stabilizer.

Here we present data showing the effect

of these processes on coppers from a variety of sources.

[(303) 497-3785]

Superconductors

Eki n , J.W., Strain Effects in

Superconducting Compounds, Advances

in Cryogenic Engineering—Materials,

Vol . 30, pp. 823-836 (July 1984).

An overview of the effect of strain on

the critical current, critical field,

and critical temperature of A15, Bl, and

C15 superconductors is presented.

Reversible elastic strain effects in

many A15 superconductors have been

measured, analyzed and compared in terms

of simple strain scaling parameters. In

addition, a new critical parameter —

critical strain c — is described and

used to characterize the strain

sensitivity of these materials. The

elastic strain effect is shown to be

strongly dependent on crystal structure;

it is nonexistent in all superconductors

with the Bl and C15 crystal structure

tested thus far. Possible mechanisms

for explaining the elastic strain effect

are briefly described. [(303) 497-5448]

Eki n , J.W., Pittman, E.S.,

Goldfarb, R. B., Superszynski , M.J., and

Waltman, D.J., Training Studies of

Epoxy-Impregnated Superconductor

Windings - Part III: Epoxies,

Conductor Insulations and Copper

Ratio, Advances in Cryogenic

Engineering —Materials, Vol. 30, pp.

977-984 (July 1984).

A systematic study of the materials and

construction factors that affect

training in e p o x y - i m p r e g n a t e

superconductor windings are reported.

Using relatively small test rings (18 cm

diam), the training rate was measured

for several epoxies currently used in

magnet construction. These training

data correlated well with the strain at

fracture measured on these same epoxy

materials at 4 K. Results are also

reported on the dependence of the

training rate on the fiberglass cloth

configuration in the winding, the type

of superconductor insulation, and the

copper-to-superconductor ratio of the

conductor. [(303) 497-5448]

Goodrich, L.F., Vecchia, D.F.,

Pittman, E.S., Ekin, J.W., and Clark,

A. F. , Critical Current Measurements

on an NbTi Superconducting Wire

Standard Reference Material, NBS

Special Publication 260-91 (September

1984), and Advances in Cryogenic

Engineering —Materials, Vol. 30,

pp. 953-960 (July 1984).

This report reviews the selection and

certification by NBS of a Standard

Reference Material (SRM) for the

measurement of superconducting critical

current. Procedures for preparing and

measuring five candidate conductors are described. Evaluation criteria are discussed by which one of the five

conductors is selected for the critical

current SRM. The designated

superconducting wire, SRM 1457, has been

subdivided and wound onto 500 spools for

distribution. Certified critical

current measurements were made on a sample of these spools. Material

variability, or inhoraogene i ty , along the

whole wire is included in a statistical

model based on the dependence of

critical current on temperature and

electric field. Critical currents for

SRM 1457 are certified at magnetic

fields of 2, 4, 6, and 8 T for

temperatures from 3.90 to 4.24 K and

electric field criteria from 0.05 to 0.2

V/cm. Statistical tolerance limits and

estimated systematic errors are combined

to give an overall uncertainty in the

certified values. The total uncertainty

is no greater than 2.57 percent of the

reported critical current at any of the

four magnetic fields. [(303) 497-3143]
Page 6

Superconductors , cont'd.

CEEE Technical Publication Announcements - March 85

Pasztor, G . and E k i n , J . W . , Development of Nb3 Sn Cabled Conductor

by External Diffuaion Process and the

Effect of Strain on the Critical

Current, Advances in Cryogenic

Engineering, Vol . 30, pp. 787-795

(July 1984).

This paper describes detailed processing

and procedures for producing stranded

Nb 3 Sn conductors using the external

diffusion technique develped by Brown,

Boveri & Co., Inc. and is at present

being pursued at the Swiss Institute for

Nuclear Research for applications in a planned high-fields test facility (12

Tesla). The results of processing

trials intended to optimize the critical

current density and at the same time to

minimize the formation of Kirkendall

voids are described. The results are presented of measurements of critical

current as a function of applied tensile

strain for a previously developed main

cable

[Contact: Ekin (303) 497-5448]

Tinkham, M., Beasley, M.R.,

Larbalestier , D.C., Clark, A.F., and

Finneraore, D.K., Research

Opportunities in Superconductivity,

Cryogenics, July 1984, pp. 378-388.

Opportunities for research in the field

of superconductivity are identified in

this report of a "Workshop on problems

in superconductivity" held at Copper

Mountain, Colorado, August 22-23, 1983.

Key problems in superconductivity, high

payoff areas of research, barriers to

progress, and the need for new

facilities are outlined in the three areas of basic physics, materials, and

devices

[Contact: Clark (303) 497-3253]

ELECTROMAGNETIC INTERFERENCE

Kanda, M. , An Electromagnetic NearField Sensor for Simultaneous Electric

and Magnetic-Field Measurements, IEEE

Trans. on Electromagnetic

Compatibility, Vol. EMC-26, No. 3, pp.

102-110 (August 1984).

This paper describes the theory of a single sensor to perform simultaneous

electric and magnetic near-field

measurements. The theory indicates that

it is possible to measure the magneticloop and electric-dipole currents using

a loop antenna terminated with identical

loads at two diametrically opposite

points. The theory also indicates that

it is possible to choose an ideal load

impedance for achieving equal electric

and magnetic-field responses of the

loop. Preliminary experiments have been

performed using a plane-wave field to

verify these results.

[(303) 497-5320]

Wyss, J.C., Anson, W.J., and Orr , R.D.,

Building Penetration Project, NBSIR

84-3009

This report documents a computer program

which calculates building attenuation of

electromagnetic radiation over the

frequency range 10 kHz - 10 GHz.

Attenuation (in dB) is computed from

building shape, dimensions, room layout,

and the electrical properties of

construction materials; no

electromagnetic measurements are

required. Details of the structure and

use of the program are given.

[Contact: Anson (303) 497-3989]

1985 CEEE CALENDAR

April 29 - May 10 (Boulder, CO)

NBS Electromagnetic Interference (EMI)

Metrology Seminar. [Contact:

Charles K.S. Miller (303) 497-3131]

July 23-25 (Vail, CO)

Short Course on Optical Fiber

Measurements. [Contact:

Robert L. Gallawa (303) 497-3761]
CEEE Technical Publication Announcements - March 85 Page 7

September 9-10

VLSI Packaging Workshop. Contact:

George G. Harman (301) 921-3621]

also planned for May - June period

Shortcourse on Near-Field Techniques

for Antenna Measurements [Contacts:

Ramon C. Baird (303) 497-3301;

Richard L. Lewis (303) 497-5196]

Seminar on Electrical Measurements in

Diagnostic X-Ray Units [Contact:

Robert E. Hebner (301) 921-3121]

NEW STANDARD REFERENCE MATERIAL

The first practical superconducting

standard reference material (SRM) has

been released by the Electromagnetic

Technology Division to the NBS Office of

Standard Reference Materials for sale to

the public. The certified parameter of

SRM 1457, Superconducting Critical

Current — NbTi Wire, is critical

current at magnetic fields of 2,4,6, and

8 tesla at a temperature of 4.2 K and an electric field criterion of 0.2 V/cra.

Information is given to permit the user

to determine critical current for

cemperatures in the range 3.90 to 4.24 K

and electric field criteria from 0.05 to

0.2 V/cm.

SRM 1457 consists of a 2.2-m length of a multifilimentary, niobium-ti tani um

copper-stabilized wire, wound in a single layer on a spool having a core diameter of 8.7 cm. The wire is

evaluated for 34 parameters relating to

current, voltage, magnetic field,

temperature, strain, and physical

specimen characteristics.

In conjunction with ASTM Standard Test

Method B714-82, D-C Critical Current of

Composite Superconductors, the new SRM

is intended to provide means for

calibrating apparatus used to measure

key parameters of superconductor

products and thus should be useful to

buyers and sellers of superconductors,

users of superconducting equipment, and

researchers in superconducting

technology

CEEE SPONSORS

National Bureau of Standards

Department of Defense

Defense Advanced Research Project

Ag ency; Combined Array/Navy/ Air

Force Calibration Coordination

Group; Defense Nuclear Agency;

National Security Agency

U.S. Air Force

Air Force Office of Scientific

Research; Air Force Satellite

Control Facility, Camp Parks;

Bolling Air Force Base; Hanscora

Field; Newark Air Force Station;

Rome Air Development Center; Space

Division; Wright-Pat terson AFB

U.S. Army

Aberdeen Proving Ground; Aviation

Research and Development Command;

Aviation Systems Command; Ballistic

Missile Defense Systems Command;

Fort Huachuca; Fort Monmouth; Harry

Diamond Laboratories; Materials & Mechanics Research Center

U.S. Navy

Aviation Logistics Center (Patuxent

River); Metrology Engineering Center

(Seal Beach); Naval Air Systems

Command; Naval Sea Systems Command;

Naval Ship Research & Development

Center; Naval Ship Systems

Engineering Station; Naval Surface

Weapons Center; Naval Weapons

Support Center (Crane); Office of

Naval Research

Department of Energy

Energy Systems Research; Fusion

Energy

Department of Health & Human Services

Food and Drug Administration

National Center for Devices & Radiological Health

National Institute for Occupational

Safety and Health

Department of Justice

Law Enforcement Assistance

Adrai ni s t rat ion
Page 8

CEEE SPONSORS, cont 'd.

CEEE Technical Publication Announcements - March 85

Department of Transportation

National Highway Traffic Safety

Adrainistrat ion

Environmental Protection Agency

GTE Satellite Corporation

International Copper Research

Association

International Telecommunications

Satellite Organization

Massachusetts Institute of Technology

National Aeronautics & Space

Administration

Lewis Research Center

National Radio Astronomy Observatory

RCA

Sandia National Laboratories

University of California Los Alamos

Scientific Laboratory
NBS-114A (REV. 2-60

U.5. DEPT. OF COMM.

BIBLIOGRAPHIC DATA

SHEET (See instructions)

1. PUBLICATION OR

REPORT NO.

NBSIR 85-3106

2. Performing Organ. Report No. 3. Publication Date

March 1985

4.

TITLE AND SUBTITLE

Center for Electronics and Electrical Engineering Technical Publication Announcements

Covering Center Programs, July - September 1984 with 1985 CEEE Events Calendar

5.

AUTHOR(S)

J. Franklin Mayo-Wells, Compiler

6.

PERFORMING ORGANIZATION (If joint or other than N BS. see instructions)

national bureau of standards

DEPARTMENT OF COMMERCE

WASHINGTON, D.C. 20234

7. Contract/Grant No.

I. Type of Report & Period Covered

July - September 1984

9.

SPONSORING ORGANIZATION NAME AND COMPLETE ADDRESS (Street. City, Stole, ZIP)

U.S. Department of Commerce

National Bureau of Standards

National Engineering Laboratory

Center for Electronics and Electrical Engineering

10.

SUPPLEMENTARY NOTES

All technical information included in this document has been approved for

publication previously.

J Document describes a computer program; SF-185, FIPS Software Summary, is attached.

11.

ABSTRACT (A 200-word or less factual summary of most significant information. If document includes a significant

bibliography or literature survey, mention it here)

This is the second issue of a quarterly abstract journal covering the work of the

National Bureau of Standards Center for Electronics and Electrical Engineering.

This issue of the Center for Electronics and Electrical Engineering Technical

Publication Announcements covers the third quarter of calendar year 1984. Abstracts

are provided by technical area for papers published this quarter.

12.

KEY WORDS (Six to twelve entries; alphabetical order; capitalize only proper names; and separate key words by semicolon i antennas; electrical engineering; electrical power; electromagnetic Interference;

electronics; instrumentation; laser; magnetics; microwave; optical fibers;

semiconductors; superconductors

13.

AVAILABILITY

Unlimited

| | For Official Distribution. Do Not Release to NTIS

PH Order From Superintendent of Documents, U.S. Government Printing Office, Washington, D.C. 20402.

fXX Of der From National Technical Information Service (NTIS), Springfield, VA. 22161

14. NO. OF

PRINTED PAGES

12

IS. Pnca

$7.00

uico l*DC • 04 » •
CENTER FOR

ELECTRONICS AND ELECTRICAL ENGINEERING

ELECTROSYSTEMS WYISON

I Applied IMeasur

Electrical Measurements

(Electronic MInstrumentation land Metrology

ELECTROMAGNETE FELDS

OIVtSJON H

Antenna Systems

Metrology

^Wds

Characterizetioii H

Interference

Characterization

ELECTROMAGNETIC TECHNOLOGY

ENVISION

HMicrowave Metrology

JOptical Electronic (Metrology

H

Cryoelectronics

Metrology

Superconductors

and Magnetic

Materials

SEMICONDUCTOR

MATERIALS ANO

PROCESSES

DIVISION

JSicoa

(Characterization

(Process Control

I Measurements

HMicremetreloiy

(Compound

I Semiconductor HProcessing Fadty

SEMICONDUCTOR DEVOS AND wonts

DIVISION H

H

Integrated

Circuit Test

Structores

Device and

Process

Modeling

^Device

•tetralogy

NBS/CEEE/FEB *4

Mr. Judson C. French (301)

Mr. Robert I. Scace (301)

KEY CONTACTS

Center (720)

Director

Deputy Director

Electrosystems Division (722)

Chief Dr. Oskars Petersons (301)

Electromagnetic Fields Division (723)

Chief Mr. Charles K.S. Miller (303)

Electromagnetic Technology Division (724)

Chief Dr. Robert A. Kamper (303)

Semiconductor Materials and Processes Division (725)

Acting Chief Mr. Frank Oettinger (301)

Semiconductor Devices and Circuits Division (726)

Chief Dr. Kenneth F. Galloway (301)

921-3357

921-3357

921-2328

497-3131

497-3535

921-3786

921-3541

INFORMATION:

For additional information on the Center for Electronics and Electrical

Engineering, write to or call:

Center for Electronics and Electrical Engineering

National Bureau of Standards

Metrology Building, Room B-358

Gaithersburg, Maryland 20899

/a

Telephone (301) 921-3357

USCOMM-NBS-DC