NCMC Workshop Report

NCMC-9: Combinatorial Methods for 

Nanostructured Materials

Michael J. Fasolka

Carol E. Laumeier

NISTIR 7332
 

NISTIR 7332

NCMC Workshop Report

NCMC-9: Combinatorial Methods for 

Nanostructured Materials

Michael J. Fasolka

Carol E. Laumeier

Multivariant Measurement Methods Group

Polymers Division

Materials Science and Engineering Laboratory

National Institute of Standards and Technology

Gaithersburg, MD 20899-8542

July 2006

U.S. Department of Commerce

Carlos M. Gutierrez, Secretary

Technology Administration

Robert Cresanti, Under Secretary of Commerce for Technology

National Institute of Standards and Technology

 William Jeffrey, Director
NIST Combinatorial Methods Center (NCMC) Page 3 of 15

NCMC Workshop Report 

NCMC-9: Combinatorial Methods for Nanostructured Materials 

Hosted by the NIST Combinatorial Methods Center (NCMC) 

April 24-25, 2006 

National Institute of Standards and Technology, Gaithersburg, MD 20899

1) Introduction and NCMC-9 Workshop Goals 

Traditionally, industrial producers of semiconductors, microelectronics, catalysts, and 

biotechnology have been considered the commercial stakeholders of nanotechnology and 

nanostructured materials. However, recent years have seen a new focus on nanostructured 

materials by industries involved in a growing set of commercial goods, including personal care 

products and cosmetics, advanced coatings and paints, automotive components, structural 

plastics, and adhesives. A part of this new focus might be considered a redefinition of terms, 

driven by an exciting, well publicized technological theme. Nevertheless, the fact is that the 

materials and chemical industries are striving to incorporate nanostructured materials into more of 

their products, and this is because nanostructured components promise (and sometimes realize) 

radically improved properties and performance. In this respect, an explicit connection of this 

expanded set of goods with nanotechnology is essential, since it provides the appropriate 

conceptual, scientific, and metrology frameworks for the design, characterization, and 

manufacture of these innovative products. 

NCMC-9: Combinatorial Methods for Nanostructured Materials was a forum to examine the 

application and development of nanostructured materials by industry, with a focus on polymeric 

products, such as films, coatings and paints, adhesives, and personal care products. Over two 

days, the Workshop brought together more than 35 industrial representatives, primarily from 

NCMC member organizations; three academic representatives; and more than 30 NIST staff (see 

Appendix B, NCMC-9 Participant List). 

In conjunction with NIST’s mission of advancing measurement technologies that stimulate 

industry innovation, and the specific NCMC mission of developing combinatorial and highthroughput measurement methods for materials research, NCMC-9 had two main goals: 

1. To examine key measurement needs in industrial development and application of 

nanostructured polymer materials; and 

2. To arrive at priorities for the development of combinatorial and high-throughput 

measurement methods for nanostructured polymer materials. 

2) NCMC-9 Technical Program 

The NCMC-9 Technical Program (see Appendix A, NCMC-9 Agenda) provided scientific context 

for the Workshop goals, and introduced ideas germane to a Discussion Session (see following 

Sections 3 and 4). Opening remarks from Richard Kayser, Director of the NIST Materials 
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Science and Engineering Laboratory (MSEL), outlined the Workshop’s relationship to the NIST 

(www.nist.gov) and MSEL (www.msel.nist.gov) missions of advancing measurement science and 

technology. Afterwards, NCMC Director Michael Fasolka discussed the goals and structure of 

NCMC-9. 

A set of plenary lectures illuminated scientific concepts in polymeric nanomaterials and outlined 

measurement methods for characterizing these systems. To kick-off the technical symposium, 

Fiona Case, of Case Scientific, lectured on Applications of Nanotechnology in Soft Materials: 

Cosmetics, Foods, Personal Care, Pharmaceutical and Oil Industries. This presentation gave an 

overview of how nanostructured polymer surfactants, micelles, colloids, and emulsions are used 

in industrial products, and the principles of designing such systems for commercial applications. 

In complement, Prof. Daniel Savin, of the University of Vermont, lectured on a range of light 

scattering techniques, which are particularly useful for measuring the structure and dynamics of 

fluid polymer nanomaterials. Prof. Savin’s presentation detailed the measurement fundamentals 

of these methods and demonstrated their application via a discussion of his current research in 

pH and temperature responsive block copolymer systems. In addition, a presentation by Peter 

Harris, of Veeco Metrology Inc., gave an overview of Scanned Probe Microscopy (SPM) 

techniques for characterizing polymer materials. Mr. Harris’ lecture detailed several emerging 

SPM methods for imaging soft nanostructures. 

Another set of invited lectures demonstrated the application of combinatorial and high-throughput 

(C&HT) methods to nanomaterials discovery and development. Karl Maurer, of CombiMatrix 

Inc., described a micro-array platform for the rapid synthesis and screening of small 

biomolecules. Mr. Maurer’s presentation exemplified the wide success C&HT approaches have 

had in the biotechnology sector. Returning to the Workshop’s focus on polymers, Prof. Sergiy 

Minko, of Clarkson University, described approaches for fabricating combinatorial libraries of 

functional surface-grafted polymers. As Prof. Minko demonstrated, such libraries enable highthroughput assessment of interfacial interactions, which are critical to the engineering of thin 

nanomaterials and nanoparticles. In the next presentation, Prof. Thomas Epps, of the University 

of Delaware, lectured on gradient combinatorial methods for measuring the effect of surface and 

interfacial interactions on the self-assembly of network forming block copolymer films. Prof. Epps’ 

presentation was an overview of his post-doctoral work with the NCMC, and included new 

gradient methods for varying governing interfacial interactions at both the substrate and the free 

surface of films. 

 A number of presentations reported on NCMC and NIST Polymers Division research. Generally, 

these talks focused on new combinatorial and high-throughput measurement methods for 

nanostructured polymer materials. Thomas Chastek, NCMC, presented a new microfluidic 

device for dynamic light scattering measurements of fluid borne nanoparticles and 

nanostructures. This “lab on a chip” instrument enables rapid, continuous assessment of 

nanostructure size, while using very small sample volumes – two prerequisites for a viable C&HT 

measurement platform. 

Chris Stafford, NCMC, discussed new gradient combinatorial approaches for measuring mold 

adhesion in nanoimprint lithography. Such methods will enable more rapid development of 

processing routes and mold release agents for this emerging nanomanufacturing route. In 

addition, Dr. Stafford presented a recently published work concerning the NCMC Flow Coater 

device. This instrument fabricates continuous gradient libraries of polymer film thickness, which 

provide a foundation for rapid, thorough measures of the effect of thickness on film materials and 

device performance. 

Michael Fasolka, NCMC Director, presented a new NCMC technique for the high-throughput 

preparation of samples for transmission electron microscopy (TEM) analysis. This method 

harnesses a “peel off” approach to simultaneously harvest many samples from a combinatorial 

film library, and suggests a first step towards C&HT TEM of polymer materials. 
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Chang Xu, NCMC, lectured on his work in developing micropatterned gradient libraries of grafted 

polymers. When complete, these combinatorial surfaces will enable high-throughput assessment 

of film properties and reference substrates for advanced SPM methods and other microscopies. 

Alamgir Karim, Group Leader of the Polymers Division’s new Nanostructured Materials Group, 

gave an overview of research and projects in nanoimprint lithography, defect metrology, and 

thermal management in active nanodevices. The new Group’s efforts include the development 

and application of C&HT methods, as illustrated by Brian Berry, NCMC, who presented his 

measurements of domain orientation in block copolymer thin films. 

The final set of talks highlighted new interactions the NCMC is building with other institutions. 

The first presentation was given by InsightFaraday, which joined the NCMC this year. Steve 

Fletcher, Director of InsightFaraday Partnership, gave an overview of the goals and structure of 

the institution, which serves UK industries interested in C&HT methods much in the same way 

that the NCMC works with US firms. In addition, InsightFaraday associate Jawwad Darr, of 

Queen Mary University, London, outlined his work in the combinatorial synthesis of nanoparticles 

useful in applications such as fuel cells, photocatalysts, and sunscreens. 

Celesta Fong, CSIRO (Commonwealth Scientific and Industrial Research Organisation, 

Australia), summarized molecular technologies and health research at CSIRO, and described her 

work examining surfactant nano- and meso-phases. Dr. Fong also introduced a current NISTCSIRO collaboration aimed at developing high-throughput measurements for surfactant phase 

behavior. 

Dan Cutbirth, of nScrypt Inc., described a prototype fluid deposition system developed recently 

through a NIST Small Business Innovation Research (SBIR) Grant. Capable of blending and 

depositing small quantities of up to three input fluids, including viscous polymer solutions and 

nanoparticle laden liquids, the nScrypt instrument suggests a promising route for fabricating 

combinatorial libraries of nanostructured polymer materials. 

NCMC-9 concluded with a series of tours and demonstrations in the NCMC laboratory facilities. 

Demonstration stations included the NIST flow coater, the nScrypt deposition system prototype, 

deposition of epoxy libraries, microfluidic dynamic light scattering, static light scattering, buckling 

measurements of modulus, the NIST CD-SAXS (Critical Dimension Small Angle X-Ray 

Scattering) instrument, and gradient libraries of organic electronics materials. 

 

3) NCMC-9 Discussion Session Goals and Guiding Questions 

A central part of NCMC-9 was a Discussion Session, which was structured to: 

• Examine key measurement needs in industrial development and application of 

nanostructured materials; and 

• Determine priorities for the development of combinatorial and high-throughput 

measurement methods for nanostructured materials. 

This Discussion was moderated by Michael Fasolka, Alamgir Karim, and Kathryn Beers, and 

flipchart notes were compiled by Carol Laumeier, NCMC Outreach Coordinator. To guide the 

Discussion, the major themes and specific questions to be considered were distributed to 

participants in advance of the Workshop, and are outlined as follows: 

Theme I: Scope of Metrology Needs 

• In your company, what aspects of nanomaterials development or application require new or 

improved measurement methods? Examples to consider: 

− Basic R&D: design and testing of custom fabricated materials

− Evaluation of raw materials from internal or external suppliers
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− Formulation of products with nanostructured components

− Performance of new products

− Testing of manufacturing and/or processing routes

− Quality control and/or failure

• Of these aspects, where would new combinatorial and high-throughput measurement 

capabilities be most important? 

 

Theme II: Key Materials Properties 

• What new materials’ property information is critical for the development or application of 

nanomaterials in your company? 

• Of these properties, for which is it critical that new combinatorial/high-throughput 

measurement methods be developed or improved? 

Theme III: Key Test Methods 

• For nanomaterials analysis, are existing test methods and strategies adequate? 

• What measurement tools and instruments do you currently find most useful for nanomaterials 

testing and analysis? 

• Of the tools you use for nanomaterials analysis, which one would be most valuable if it were 

developed into a combinatorial/high-throughput measurement technique? 

• What entirely new test needs to be developed? What entirely new combi/high-throughput 

test needs to be developed? 

4) Discussion Results and Workshop Conclusions 

The Discussion Session, participant responses to presentations, and informal interactions over 

the two days of the NCMC-9 Workshop yielded several points of consensus relating to the 

Workshop goals. These conclusions, outlined as follows, are organized in terms of the guiding 

Discussion themes and questions. 

Workshop Goal 1: Discuss key measurement needs in the industrial development and 

application of nanostructured polymer materials. 

I. Scope of Metrology Needs 

With respect to polymer-based nanomaterials, industrial Workshop participants noted that 

improved measurement methods are required throughout their R&D, manufacturing, and 

quality control processes. However, this industrial community emphasized that 

nanostructured materials are generally part of formulated products, such as personal care 

goods, cosmetics, coatings, polymer blends and composites, and adhesives. Formulated 

products are very complex; they typically contain a large number of components, and have 

structure and properties that are highly sensitive to composition and processing routes. In 

formulations, nanostructured materials can be: 

1) Specialty additives. Often, polymer or inorganic nanoparticles are added to a formulation to 

improve performance. In this case, measurements of raw nanomaterial additives are 

important, as stocks are often from outside suppliers, or fabricated in-house using new 

synthesis routes. Moreover, once added to a formulation, measurements of nanoparticle 

distribution are critical. 

2) The goal of the formulation. In many formulations, organic molecular components such as 

surfactants and block copolymers are added with the goal of creating nanostructured products. 

In these cases, measurements of the formation and structure of nanoscale emulsions, 

micelles, colloids, and blends in formulations are essential. 
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In addition, in both of these cases, industry requires measurement approaches that illuminate 

relationships among the nanoscale structure of products, processing routes, and their 

performance properties. To accommodate the large number of experiments needed to 

determine these multivariate relationships, industry needs measurement approaches that are 

both rapid and thorough. 

II. Key Materials Properties 

Industry Workshop participants identified three types of property information as critical for the 

development or application of polymer nanomaterials: 

1) Nanostructure Morphology. Measurements of the morphology of nanostructured components 

are needed to gauge the success of formulation designs or processing routes, and to build 

structure-property relationships. 

• In the case of nanoparticle additives, measurements of the size, size distribution, and 

shape/shape distribution of raw materials are necessary. Particular concerns of the quality 

of carbon nanotube stocks were noted. Moreover, after these particles are added to a 

polymer formulation, measurements of the particle dispersion, flocculation, and stability are 

essential. 

• Similar verification measurements are required in the case of polymer fluid and solid 

formulations. Here, assessment of the size-scale and morphology of emulsions, micelles, 

and other polymer nanophases are critical. 

 

2) Nanostructure Chemistry/Composition. As with morphology, information about the chemistry 

and/or composition of nanostructures is needed to verify formulated products: 

• For nanoparticle additives, industry requires chemical measurements to verify the quality of 

particle stocks, or the routes they use to functionalize particles for more effective 

deployment in formulations, e.g., proper exfoliation of clay nanoparticles. In this latter case, 

surface-sensitive chemical information is essential, as functionalization layers can be less 

than 1 nm thick.

• For nanostructured formulations, information on the spatial distribution of organic modifiers, 

such as surfactants and block copolymers, are necessary. In this respect, chemical 

analyses amenable to organic materials and with nano-scale spatial resolution are needed. 

 

3) Performance Properties. Ultimately, performance properties determine the success of 

nanostructured products. Workshop participants identified two critical performance measures:

• Rheological Properties. Many participants identified rheological properties (viscosity, 

complex viscosity, and flow characteristics) as the most important set of information they 

require about nanostructured polymer products. For nanostructured fluids and melts, 

rheological information allows industry to optimize processing parameters. In addition, 

rheology data enables prediction of a variety of related, but often more complex, 

performance properties; for example, spreadability and film forming in coatings; and texture 

and “skin feel” in personal care products and cosmetics. Moreover, in industry, rheological 

measurements are an indirect, but widespread means to verify the morphology of fluid 

formulations. In all of these cases, complex rheological information (i.e. storage and loss 

data) is needed over a large range of shear rates and flow conditions. 

• Mechanical Properties. For polymer materials such as coatings, adhesives, and structural 

plastics, nanoparticle additives or a nanostructured formulation can give enhanced or 

tailored mechanical properties. Accordingly, measurements of modulus that verify product 

mechanical property goals are important. Moreover, some industrial parties highlighted the 

need for in-situ measurements of the mechanical properties of individual nanoparticles, 

single nanodomains, or ultra-thin film systems. This, of course, requires more 

sophisticated, more sensitive measurement techniques with nano-scale resolution.

III. Key Test Methods 

Workshop participants identified five key measurement methods they currently use for 

characterization of nanostructured polymer products: 
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1) Electron Microscopy (EM). Transmission Electron Microscopy (TEM) is the primary tool 

industry uses to measure the morphology of nanostructures in solid products. TEM provides 

information on the size and shape of raw nanoparticle stocks, the internal structure of these 

materials, and the distribution (dispersion, flocculation, exfoliation, etc.) of nanoparticles 

deployed in polymer formulations. TEM also provides measurements of the morphology of 

polymer nanophases, e.g., micelles, emulsions, and microphase separated block 

copolymers. However, as noted below, TEM relies on slow, meticulous preparation of ultrathin samples, and is only appropriate for solid specimens. To a lesser extent, Field-Emission 

Scanning Electron Microscopy (FESEM) is also used for these purposes, and similar 

challenges to sample preparation are apparent. Generally, nanoscale chemical information 

provided by some EM instruments (e.g., via Energy Dispersive Spectrometry) are not 

applicable to polymer specimens. 

2) Scanning Probe Microscopy (SPM). A basic SPM, i.e., Atomic Force Microscopy (AFM), is 

employed widely by industry to assess the morphology of nanostructures in solid polymer 

materials. AFM can be easier to use than EM, and it is more amenable to automation. 

However, for of bulk specimens, SPM analysis requires production of a flat, smooth surface, 

which like EM sample preparation, can be slow and difficult. Advanced SPM techniques, 

such as Chemical Force Microscopy and Atomic Force Acoustic Microscopy, which promise 

nanoscale assessment of chemical and mechanical and other properties, generated 

considerable interest from industrial participants. However, since they generally provide 

unproven, qualitative data, these new methods are rarely used in industry at this time. 

Nanoindentation is highly regarded for its quantitative measurements of local mechanical 

properties in inorganic materials, but this technique tends to be unreliable for soft polymer 

substances. 

3) Scattering Methods. Dynamic and static light scattering are ubiquitous tools in industry for 

basic particle and domain sizing in nanostructured polymer products. To a lesser extent, xray scattering techniques are used to determine the internal structure of inorganic 

nanoparticle stocks and the distribution of molecular species in organic formulations. For 

both light and x-ray scattering measurements, industry generally employs traditional 

instrumentation, which is geared for single specimens. Neutron scattering is recognized by 

industry as highly powerful for measuring nanostructures in polymer materials. However, 

industrial access to these measurements is limited. 

 

4) Spectroscopy Methods. Basic Infra-red, Raman, and UV-vis spectroscopies are used to 

measure average compositions of polymer formulations and nanoparticle stocks. To a lesser 

extent, industry employs these, and more surface-sensitive techniques such as x-ray 

photoelectron spectroscopy, to assess nanoparticle functionalization. As with scattering 

methods, industry generally employs traditional spectroscopy instruments, which are aligned 

toward single specimens. 

5) Rheometry. As previously noted, complex rheology information is highly valued by industry 

for gauging the performance, and often morphology, of nanostructured polymer products. To 

gain this information, industry researchers typically employ traditional rotational rheometers. 

These instruments provide the shear rate range necessary for product evaluation, but are 

severely limited in their capacity to accommodate the large numbers of formulations they 

wish to measure. 

Workshop Goal 2: Arrive at priorities for the development of combinatorial and high-throughput 

measurement methods for nanostructured polymer materials. 

For the rapid development of innovative nanostructured materials, industrial researchers are 

faced with two major problems: 
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First, industry is challenged by the large, complex variable spaces formulated nanomaterials 

present, and thus the huge number of measurements required to discover and optimize these 

new products. Of course, in many companies, a degree of combinatorial and high-throughput 

(C&HT) infrastructure is already in place for traditional formulated products. However, this 

instrumentation often is not suitable for C&HT analysis of the new set of nanostructured polymer 

products considered in this Workshop. Indeed, this challenge mirrors the situation of perhaps 5-

to-7 years ago, when the materials and chemicals industries started to adapt C&HT approaches 

geared for biotechnology and genomics to formulations problems relating to traditional coatings 

and adhesives. 

The second problem involves the methods industry uses to measure the morphology and 

performance of nanostructured products. As discussed previously, industry currently relies on a 

number of key measurements and instruments (e.g., EM) to conduct this analysis. While these 

methods generally provide appropriate data, instruments are aligned most often with traditional, 

one-at-a-time experimental paradigms that are not commensurate with the C&HT approaches 

industry strives to adopt for nanostructured systems. 

With respect to these broad challenges, industry Workshop participants identified five priority 

areas for the development of C&HT measurement methods for nanostructured polymer materials. 

For each of these areas, existing or possible NIST/NCMC responses to the problem are outlined. 

1) Library Preparation Methods. Advancement of C&HT measurement methods for 

nanostructured materials hinges on the ability to produce appropriate specimen libraries. With 

respect to this primary barrier, Workshop participants emphasized the following needs: 

• Routes for preparing multivariate libraries that systematically vary the formulative and 

processing parameters relevant to nanostructured materials. These libraries should vary 

multicomponent composition with precision that reflects the sensitivity nanostructured 

materials have for this parameter. Means for processing include temperature, mixing, and 

order of component addition. Automated preparation approaches need to effectively 

handle and combine both fluids and solids, accommodate particle-laden materials, and 

higher viscosity liquids. Significant reliability testing of such systems needs to ensure that 

library elements are comparable to single-specimens prepared by traditional means. 

• Specimen libraries must be compatible with analysis by key measurement tools such as 

EM, SPM, scattering, spectroscopy and rheometry. Specific issues related to each of 

these techniques are noted in the following Points 2-5. 

Response: The NCMC staff has prepared three related Measurement Need Statements, 

entitled Nanomanufactured Components in Complex Fluids, Advanced Specialty Materials, 

and Adhesion and Performance of Underfill Materials for the U.S. Measurement System 

(USMS, www.usms.nist.gov). These statements will be included in the USMS measurement 

needs assessment, which is to be published later in 2006. NCMC has extensive experience in 

library design, and in the preparation of libraries for new types of materials. Indeed, current 

NCMC work in adhesives and microfluidics technologies is either suited for nanostructured 

polymer products, or could be modified to accommodate these materials. 

2) Specimen Libraries for EM and Basic SPM. The key measurement tool for nanostructured 

polymer identified by industry participants was EM, particularly TEM. Currently the 

preparation of suitable specimens is the bottleneck process in TEM analysis, and the major 

barrier to the development of the higher-throughput EM measurements needed to accelerate 

testing of nanostructured formulations. The ≈ 50 nm thick polymer samples needed for TEM 

are generally prepared using cryogenic ultramicrotomy, which is very slow and difficult. 

Preparation of specimens for SPM or FESEM can be equally slow if ultramicrotomy is needed 

to create flat sample surfaces for analysis. Alternative methods to generate arrays of TEM or 

SPM samples, drawn from combinatorial libraries, would greatly speed the analysis of 

potential new products. 
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Response: The NCMC-9 technical presentations gave preliminary data on a new NCMC 

method for the high-throughput preparation of TEM specimens. This work is currently in 

progress. In addition, at NCMC-6, a NCMC Focus Project was proposed for the development 

of HT methods for SPM or FESEM analysis. Contact Michael Fasolka at mfasolka@nist.gov

for more information on this research. 

 

3) Scattering and Spectroscopy Methods. While these are used widely by industry for 

nanomaterials analysis, library fabrication and manipulation barriers hinder their full 

realization as C&HT measurement tools. In particular, industry requires: 

• New apparatus designs that enable delivery of rapid series of fluid specimens across 

scattering or spectroscopic source beams. In this respect, designs that harness milliand micro-fluidic technologies are of great interest. 

• Instrument designs that enable automated scattering and spectroscopic measurements 

of combinatorial specimen arrays. There is a general paucity of these designs among 

commercial light-scattering and x-ray scattering instrumentation. In addition, industrial 

participants stressed that it would be extremely useful if basic automation capabilities 

were added to the advanced neutron and x-ray scattering equipment found in the 

National Laboratories. Basic automation tools would allow industry (indeed all users) to 

analyze combinatorial libraries at these facilities, and thus increase the number of 

measurements they are able to complete in an experimental session. 

• Guidance on conducting scattering and spectroscopic measurements on small 

specimen volumes, which are common to combinatorial libraries. 

Response: NCMC is currently working towards the integration of both scattering and 

spectroscopic measurements with microfluidic device technologies. Indeed, a presentation at 

NCMC-9 demonstrated a new microfluidic device for performing dynamic light scattering 

measurements on nanostructured fluids. Contact Kathryn Beers (kathryn.beers@nist.gov) for 

more information about this work. In addition, the NCMC will continue to work with industry 

participants towards a series of recommendations regarding automated array analysis to be 

distributed to National Laboratory user facilities, including the NIST Center for Neutron 

Research. A USMS measurement need statement can be prepared in this area. 

 

4) Rheology Methods. To accelerate the analysis of nanostructured polymer formulations of 

industry, new rheometry instrumentation and designs are needed. For C&HT measurements, 

rheometers need to: 

• Provide complex rheology information over a large range of shear rates. 

• Conduct parallel measurements of many specimens simultaneously, or conduct serial 

measurements in a rapid, automated manner. 

• Measure the small liquid volumes inherent to most C&HT methods. 

In addition, some Workshop participants expressed interest in simultaneous measurement of 

both rheometry and scattering. 

Response: NCMC has published designs for a complex rheometer that conducts parallel 

measurements of multiple specimens (Walls et al, Measurement Science and Technology 16: 

137-143 (2005). Contact Kathryn Beers (kathryn.beers@nist.gov) for more information about 

this work. A USMS measurement need statement can be prepared in this area. Moreover, 

this appears to be a prime area for a future NCMC Focus Project. 

 

5) Advanced SPM techniques. SPM instrumentation is amenable to automation, making it 

viable for inclusion in a C&HT measurement workflow. However, as discussed previously, 

industry only uses basic SPM, since more advanced modes are unproven and not 

quantitative. Development of quantitative advanced SPM measurements, e.g., Chemical 

Force Microscopy, or Atomic Force Acoustic Microscopy, would allow industry to accomplish 
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nanoscale measurements of chemical and mechanical properties, while leveraging the 

instrumentation they already have in-house. 

 Response: NCMC researchers prepared a related USMS measurement need statement, 

Advanced Scanning Probe Microscopies (see above). In addition, a NCMC project was 

defined in this area, and first papers were published in 2005 (e.g., Julthongpiput et al, 

Nanoletters 5(8): 1535-1540 (2005)). 

5) For More Information 

• For more information about the NCMC-9 Workshop, NIST Combinatorial Methods Center, 

NCMC research, or NCMC membership, please visit the NCMC Web site at 

www.nist.gov/combi, or contact: 

Carol Laumeier, NCMC Outreach Coordinator 

carol.laumeier@nist.gov 

301-975-6093 

Michael Fasolka, NCMC Director 

mfasolka@nist.gov

301-975-8526 

• For more information about specific NCMC measurement technologies, contact: 

Kathryn Beers, Project Leader, Polymer Formulations 

kathryn.beers@nist.gov

301-975-2113 

Chris Stafford, Project Leader, Mechanics of Complex Interfaces 

chris.stafford@nist.gov 

301-975-4368 

Michael Fasolka, Project Leader, SPM Reference Specimens and Nanomaterials 

mfasolka@nist.gov

301-975-8526 

• For more information on the U.S. Measurement System Project, see www.usms.nist.gov, or 

contact: 

Dennis Swyt, Director, USMS Project 

dennis.swyt@nist.gov

301-975-3463 
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Appendix A: NCMC-9 Agenda

NCMC-9: Combinatorial Methods for Nanostructured Materials 

April 24 - 25, 2006 ◊ Bldg. 101 / Lecture Room B 

Monday, April 24, 2006 - Morning 

8:45 am Welcome and Introduction 

Richard Kayser, Director, Materials Science and Engineering Laboratory, NIST 

Michael Fasolka, Director, NIST Combinatorial Methods Center

 

Industrial Application of Nanomaterials

9:00 am Plenary Lecture 

 Fiona Case, Case Scientific Inc. 

Applications of Nanotechnology in Soft Materials: Cosmetics, Foods, Personal 

Care, Pharmaceutical and Oil Industries 

 

10:00 am Karl Maurer, CombiMatrix Corp.

Building addressable molecular libraries: combinatorial synthesis and analysis of 

small molecules on a 12,000 feature microelectrode array 

11:00 am Plenary Lecture 

 Prof. Daniel Savin, University of Vermont 

 Light Scattering Techniques for Polymer Materials 

 

11:45 am Thomas Chastek, Polymers Division, NIST 

High-Throughput Light Scattering Measurements 

12:05 pm Peter Harris, Veeco Instruments 

Advanced Scanning Probe Microscopy Techniques 

Monday, April 24, 2006 - Afternoon

Combi Methods for Thin Nanostructured Materials

1:30 pm Invited Lecture 

Prof. Sergiy Minko, Clarkson University 

Combinatorial approach to the problem of interfacial interactions via 

gradient polymer brushes 

2:15 pm Invited Lecture 

Prof. Thomas Epps, University of Delaware 

Combinatorial Studies of Block Copolymer Interactions with Surfaces 

3:15 pm Alamgir Karim, Polymers Division, NIST 

Nanostructured Materials Group 

3:45 pm Christopher Stafford, Polymers Division, NIST 

Combinatorial approaches to nanoimprint lithography 
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Discussion Session

4:15 pm Introduction: Michael Fasolka, Director, NIST Combinatorial Methods Center 

4:20 pm Discussion: Fasolka, Beers, Karim Moderators 

 Goals: 

• Discuss key measurement needs in industrial development and 

application of nanostructured materials. 

• Arrive at priorities for the development of combinatorial and highthroughput measurement methods for nanostructured materials. 

5:15 pm Adjourn

Tuesday, April 25, 2006 – Morning 

Interactions and Update 

9:00 am Michael Fasolka, NCMC 

Welcome Back 

9:10 am Steve Fletcher and Jawwad Darr, InsightFaraday Partnership, UK 

High Throughput Nanomaterials Discovery - a UK perspective 

9:45 am Daniel Cutbirth, Nscrypt Inc. 

 Novel Deposition System for Combinatorial Libraries 

10:40 am Celesta Fong, CSIRO, Australia 

 CSIRO Overview and NCMC Interaction 

 

10:55 am Christopher Stafford, NCMC 

NIST Gradient Flow Coater 

11:15 am Michael Fasolka, NCMC 

 High throughput preparation of specimens for TEM 

11:30 am Chang Xu, NCMC 

 Combinatorial Surfaces of Grafted Polymers 

11:45 am Brian Berry, Polymers Division 

 Orientation in Nanostructured Thin Films 

12:00 pm Michael J. Fasolka

Wrap Up and Initial Discussion Summary 

NCMC Tours and Demonstrations 

1:45 pm Convene in NCMC Labs – Building 224, Rm. B204 

 See Lab Tours Handout for Schedule 

3:30 pm Adjourn – See you at NCMC-10! (October 5-6, 2006) 
NCMC-9: Combinatorial Methods for Nanostructured Materials

NIST Combinatorial Methods Center (NCMC) Page 14 of 15

Appendix B: NCMC-9 Participant List

Speakers

Fiona Case 

Case Scientific, Inc. 

fiona@casescientific.com

Dan Cutbirth 

nScrypt Inc. 

dcutbirth@nscrypt.biz

Jawwad Darr 

Queen Mary University of London 

j.a.darr@qmul.ac.uk

Thomas Epps, III 

University of Delaware 

thepps.mit@gmail.com

Steven Fletcher 

InsightFaraday Partnership 

steve.fletcher@lgc.co.uk

Peter Harris 

pharris@veeco.com

Karl Maurer 

CombiMatrix Corporation 

kmaurer@combimatrix.com

Andrew McShea 

CombiMatrix Corporation 

amcshea@combimatrix.com

Sergiy Minko 

Department of Chemistry 

Clarkson University 

sminko@clarkson.edu

Daniel Savin 

Department of Chemistry 

University of Vermont 

daniel.savin@uvm.edu

NCMC Members

Air Products and Chemicals Inc. 

Svetlana M. Ivanova 

ivanovsm@airproducts.com

Arkema, Inc. 

Nafih Mekhilef 

nafih.mekhilef@arkemagroup.com

Pierre Ricou 

pierre.ricou@arkemagroup.com

Michael E. Smith 

michael-e.smith@arkemagroup.com

Bayer 

Stephanie Strazisar 

stephanie.strazisar@bayerbms.com

Boston Scientific 

Joseph T. Delaney, Jr. 

joseph.delaney@bsci.com

Dow Chemical 

Matthew T. Bishop 

bishopmt@dow.com

Don Patrick 

dwpatrick@dow.com

Willem DeGroot 

awdegroot@dow.com

ExxonMobil 

Rick D. Davis, Ph.D. 

rick.d.davis@exxonmobil.com

John Pierce 

john.k.pierce@exxonmobil.com

Cesar Garcia-Franco 

cesar.a.garcia-franco@exxonmobile.com
NCMC-9: Combinatorial Methods for Nanostructured Materials

NIST Combinatorial Methods Center (NCMC) Page 15 of 15

Honeywell International 

Doug Calloway 

doug.calloway@honeywell.com

Nelson W. Lytle 

nelson.lytle@honeywell.com

Milton (Mickey) E. McDonnell 

mickey.mcdonnell@honeywell.com

Rich Willis 

rich.willis@honeywell.com

Hysitron Incorporated 

Oden L. Warren, Ph.D. 

owarren@hysitron.com

ICI/National Starch and Chemical 

Yadunandan L. Dar 

yadunandan.dar@nstarch.com

John Carroll 

John.Carroll@ici.com

Victor Mackewicz 

Victor.Mackewicz@nstarch.com

Wenhua Zhang 

Wenhua.Zhang@nstarch.com

InsightFaraday Partnership

Richard Bahu 

richard.bahu@btinternet.com

Malcolm Connah 

Malvern Instruments Ltd. 

malcolm.connah@malvern.co.uk

Procter and Gamble 

Elizabeth Wilder 

wilder.ea@pg.com

University of Southern Mississippi 

Robert Lochhead 

School of Polymers and High Performance 

Materials 

robert.lochhead@usm.edu

Andrew Magenau 

andrew.magenau@usm.edu

Veeco 

Richard Goodheart 

rgoodheart@veeco.com

James (Jay) Anderson 

janderson@veeco.com