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PUBLICATIONS

NBSIR 86-3486

A 11 ID 4 34L4fc>b

Center for Electronics and

Electrical Engineering

Technical

Publication

Announcements

Covering Center Programs,

January to March 1986

November 1986

U.S. Department of Commerce

National Bureau of Standards

National Engineering Laboratory

Gaithersburg, Maryland 20899

-or.100

.1156

86-3486

1986
INTRODUCTION TO THE CEEE TECHNICAL PUBLICATION ANNOUNCEMENTS

This is the eighth issue of a quarterly publication providing information on the

technical work of the National Bureau of Standards Center for Electronics and Electrical Engineering. This issue of the CEEE Technical Publication Announcements

covers the first quarter of calendar year 1986.

Organization of Bulletin ; This issue contains citations and abstracts for Center

papers published in the quarter. Entries are arranged by technical topic as identified in the table of contents and alphabetically by first author within each topic.

Following each abstract is the telephone number of the individual to contact for more

information on the topic; unless otherwise noted, this person is the first author.

This issue also includes an announcement of recently issued standard reference materials and a list of sponsors of the work.

Center for Electronics and Electrical Engineering ; Center programs provide national

reference standards, measurement methods, supporting theory and data, and traceability to national standards.

The metrological products of these programs aid economic growth by promoting equity

and efficiency in the marketplace, by removing metrological barriers to improved

productivity and innovation, by increasing U.S. competitiveness in international

markets through facilitation of compliance with international agreements, and by

providing technical bases for the development of voluntary standards for domestic and

international trade. These metrological products also aid in the development of

rational regulatory policy and promote efficient functioning of technical programs of

the Government.

The work of the Center is divided into four major programs supporting semiconductor

technology; fast signals acquisition, processing, and transmission; electrical systems; and the determination of electromagnetic interference. The Semiconductor Technology Program is the responsibility of the Semiconductor Electronics Division, and

the Electromagnetic Interference Program is the responsibility of the Electromagnetic

Fields Division. The Fast Signal Acquisition, Processing, and Transmission Program

has components in three divisions (Electrosystems, Electromagnetic Fields, and Electromagnetic Technology), and the Electrical Systems Program has components in two

(Electrosystems and Electromagnetic Technology). See the table of contents on the

opposite page for identification of the topics covered by each program, as represented in this issue. Key contacts in the Center are given on the back cover;

readers are encouraged to contact any of these individuals for further information.

Center sponsors: The Center Programs are sponsored by the National Bureau of Standards and a number of other organizations, in both the Federal and private sectors;

these are identified on page 20.

Note on Publication Lists : Bibliographies covering both recent and earlier work are available from each division. The current issue of each is identified under the

"Publications Lists" in the "Additional Information" section.
mRESEARCH

INFORMATION CENTER

CEEE Technical Publication Announcements - November 86 Page 1

TABLE OF CONTENTS

INTRODUCTION inside front cover

SEMICONDUCTOR TECHNOLOGY

Silicon Materials

Dimensional Metrology

Integrated Circuit Test Structures

FAST SIGNAL ACQUISITION, PROCESSING, & TRANSMISSION

Waveform Metrology

Cryoelectronic Metrology

Antenna Metrology

Noise Metrology

Microwave and Mil lime ter-Wave Metrology

Laser Metrology

Optical Fiber Metrology

Other Fast Signal Topics

ELECTRICAL SYSTEMS

Power Systems Metrology

Pulse Power Metrology

Magnetic Materials and Measurements

Superconductors

ELECTROMAGNETIC INTERFERENCE

ADDITIONAL INFORMATION

KEY CONTACTS IN CENTER, CENTER ORGANIZATION back cover
Page 2 CEEE Technical Publication Announcements - November 86

SEMICONDUCTOR TECHNOLOGY

Silicon Materials

Baghdadi, A., Measurement of the Oxygen and Carbon Content of Silicon

Wafers by Fourier Transform Spectrophotometry, Inorganic Materials Characterization, L.A. Casper, Ed., ACS

Symposium Series 295, pp. 208-229

(American Chemical Society, 1986).

Fourier transform infrared (FT-IR) spectrophotometry is a rapid, nondestructive

characterization technique which is

being increasingly applied on a large

scale to the routine measurement of the

oxygen and carbon content of silicon

wafers used for the fabrication of

microelectronic devices. Control of the

oxygen content is needed to achieve

acceptable yields in modern device processing, particularly for those processes which utilize oxide precipitates

to protect active regions of devices

from contamination by metallic impurities during high- temperature processing. The inter laboratory reproducibility of the measurement is not adequate

considering the degree of control of the

oxygen that is required. This review

focuses primarily on the measurement of

oxygen and carbon in silicon and on methods for improving quantitative FT-IR

absorption measurements on semiconductor

wafers.

[Contact: (301) 921-3786]

Lowney, J.R., Impurity Bands and Band

Tailing in Moderately Doped Silicon,

J. Appl. Phys. , Vol. 59, No. 6, pp.

2 048-2053 (1 5 March 1986).

The density of states of the valence and

conduction bands in silicon has been

calculated at room temperature for

dopant densities near the transition

between the existence of a distinct

impurity band and its coalescence with

the continuum band to form a band tail.

The dopant densities for the three cases considered are: 1) 1.5 x 10* 8 cm" 8 ac- ceptors; 2) 6.2 x 10 18 cm

-8 acceptors;

and 3) 1.2 x 10 18 cm" 8 donors compensated by 6.2 x 10* 8 acceptors. The

calculation is based on multiple-scattering theory with the self -energy calculated self -consistently to all orders

of the interaction. The results show a small but significant amount of effective band-gap narrowing.

[Contact: (301 ) 921-3786]

Dimensional Metrology

Nyyssonen, D. , Procedure for Calibration of Ferrite Gaps in Magnetic Tape

Heads Traceable to NBS AR-Chromium

Optical Linewidth SRMs, NBSIR 86-3306

(January 1 986) .

Accurate calibration of micrometer and

submicrometer optical linewidth measuring systems requires that the calibration standard match the properties of

the line to be measured. The NBS photomask linewidth standards have been

designed for use by the integrated circuit community and are not directly

suitable for use in other applications.

A method of calibrating systems for

measuring the width of ferrite gaps in

magnetic calibrating systems for measuring the width of ferrite gaps in magnetic tape heads has been developed that

involves a two-step calibration using

the NBS anti-ref lecting-chromi urn photomask as the primary reference standard.

This primary standard is used in transmitted green light to calibrate the

linewidths on a secondary black -chromium

photomask. This is a valid procedure

because these lines are patterned in

black -chromi urn layers that are thin

compared to the wavelength of the green

light and have negligible transmission.

Since this secondary black-chromium

photomask has similar optical properties

to ferrite gaps when viewed in reflected

green light, it can then be used to

calibrate the linewidth measuring system

to be used for ferrite gaps. The

results of a preliminary study of this

method shows that the errors associated

with this two-step process are below 0.1

pm. The study also indicated that without this two-step process, the errors could be 0.3 pm or more.
CEEE Technical Publication Announcements - November 86 Page 3

Dimensional Metrology , cont'd.

[Contact: Robert D. Larrabee (301)

921 -362b]

Integrated Circuit Test Structures

Ellenwood, C.H., and Mattis, R.L.,

Release Notes for STAT2 Version 2.00A:

An Addendum to NBS Special Publication

400-75, NBSIR 85-3292 (January 1986).

STAT2 is a FORTRAN program which is used

to analyze and display data from

microelectronic test structures

fabricated on semiconductor wafers. The

program reads data as a two-dimensional

array, extracts sample statistical

values, identifies outliers, calculates

replacement values for outliers, and

makes histograms and circular gray-tone

data maps. Version 2. 00A is an adaptation of STAT2 to run under Version

3.2 of the RSX-llM operating system.

This operating system is used on the

automatic tester which acquires the test

structure data. Data can therefore be

taken and analyzed on the same system.

[Contact: (301) 921-3801]

Mattis, R.L . , Release Notes for STAT2

Version 1.7: An Addendum to NBS Special

Publication 400-75, NBSIR 86-3333

( March 1 986) .

This document describes the changes

which have been made in the STAT2 com- puter program since its documentation in

NBS Special Publication 400-75, Semiconductor Measurement Technology: A

FORTRAN Program tor Analysis of Data

from Microelectronic Test Structures,

and NBS Internal Report 83-2779, Release

Notes for STAT2 Version 1.31. It is

assumed that the reader has these documents, and no attempt is made to review

STAT2 features or operation. The

changes extend the functionality and

versatility of the program. More specifically, the new features added in

version 1.7 include data base extension, an input data format suitable for test

sites not in a periodic array, an outlier exclusion algorithm suitable for

small numbers of sites, common site

exclusions for related data sets, a vector map, a scatter plot, a trend

chart, extended macro command file capability, and other changes. Following

the description of the changes is an annotated listing of new error messages.

This document and the two previous publications cited constitute the documentation of version 1 . 7 of STAT2.

[Contact: (301) 921-3801]

O'Keeffe, T.W., Cresswell, M.W., Linholm, L.W., and Radack, D.J. , Evaluation and Improvement of E-Beam Exposure

Routines by Use of Microelectronic Test

Structures, Extended Abstract Digest

of the IEEE VLSI Workshop on Test

Structures, Long Beach, California,

February 17-18, 1986, pp. 182-194.

This paper describes the use of the

cross-bridge test structure in conjunction with a series of interconnect test

structures to assess and improve the

exposure routines and procedures in the

replication of submicron features. The

interconnect test structures used in

this experiment are resistors which

include both serpentine and comb-like

interconnect patterns and can be used to

assess line continuity and line-to-line

isolation. Results obtained during the

evaluation of line continuity, resolution, linewidth, and proximity exposure

effects are presented.

[Contact: Loren W. Linholm (301 ) 921-

3801]

Radack, D. J. , and Linholm, L.W., The

Application of Microelectronic Test

Structures for Propagation Delay,

Extended Abstract Digest of the IEEE

VLSI Workshop on Test Structures, Long

Beach, California, February 17-18,

1986, pp. 191-207.

This paper presents a comparison of the

ring oscillator, the inverter chain, and

the delayed Johnson counter for measure- ment of the propagation delay of an

inverter. It describes design considerations that will improve the precision

and accuracy of the measurement. Modi-
Page 4 CEEE Technical Publication Announcements - November 86

IC Test Structures , cont'd.

fications to the delayed Johnson counter

which allow timing comparisons to be

performed on-chip are also described.

[Contact: (301) 921-3801]

Roitman, P. , Suehle, J. S . , Russell,

T.J., and Gaitan, M. , On the Measurement of Capacitance on Wafers,

Extended Abstract Digest of the IEEE

VLSI Workshop on Test Structures, Long

Beach, California, February 17-18,

1986, pp. 96-1 04.

Capacitance measurements of both capacitor and transistor structures can provide critical parameters for process

monitoring, process modeling, device

modeling, and circuit modeling. However, accurate measurements of capacitance on small devices located on large

silicon wafers are very difficult. The

problem is simply that very low-level

analog measurements must be made at the

end of a necessary system of cables and

probes. Several authors have proposed

building capacitance meters on the

wafer, which would provide relatively

high-level outputs to the external test

system. A method has been chosen to

improve the capability to measure

capacitance on wafers directly. This

improvement involved three parts of the

experiment: the design of the capacitors, the design of the probe fixturing,

and the instrumentation. These are discussed in turn.

[Contact: (301) 921-3625]

Schafft, H.A., Grant, T. , Mandel, J. , and Shott, J. , Report on an Interlaboratory Experiment, Extended Abstract Digest of the IEEE VLSI Workshop

on Test Structures, Long Beach, California, February 17-18, 1986, pp.

306-325.

An interlaboratory experiment involving

1 5 laboratories and associated experiments conducted at NBS are described and

the results given. The twofold purpose

of the ejgjeriments is 1) to assess the

reproducibility of electromigration

characterizations made with equivalent

test structures by laboratories using

their own test methods and 2) to broaden

the technical base needed to develop

electromigration guidelines. Specially

designed test chips (NBS-42) , from one metallization lot, were used in the

experiments. The electromigration test

structures provided to the participating

laboratories are made of unpassivated,

sputter-deposited Al 1%Si on oxidized

Si.

[Contact: (301 ) 921-3801 ]

Schafft, H.A., and Saxena, A.N. , Electromigration Test Methodology and Characterization, Proceedings of the

Third IBM Electromigration Symposium,

Poughkeepsie, New York, April 1-2,

1985, unpaged.

The accuracy of electromigration characterizations of metallizations may be

affected significantly by the design of

the electromigration test structure and

by the conditions and procedures used in

testing these structures. These effects

are shown in a thermal analysis of a straight-line test structure and its

packaging. The analysis uses a thermal

model for an electromigration test

structure from which equations are

derived to calculate the temperature

profile along the structure. It also

uses experimental evidence to validate

the thermal model and the use of a series of thermal resistance and

capacitance networks to model the heat

flow from the metallization through the

silicon chip, package, and heat sink,

and on to the oven environment.

[Contact: (301) 921-3801]

FAST SIGNAL ACQUISITION, PROCESSING, &

TRANSMISSION

Waveform Metrology

Gans, W.L., Calibration and Error

Analysis of a Picosecond Pulse Waveform

Measurement System at NBS, Proceeding

of the IEEE, Special Issue on Radio
CEEE Technical Publication Announcements - November 86 Page 5

Waveform Metrology , cont'd.

Measurement Methods and Standards, Vol.

74, No. 1, pp. 86-90 (January 1986).

The primary system used at the National

Bureau of Standards to measure fast

( p i c o s e c o n d- n a n o s e c o n d range),

repetitive, electrical pulse parameters

consists of a wide-band (dc-18 GHz)

sampling oscilloscope interfaced to a minicomputer. This paper describes the

major calibration and analysis

techniques used to reduce the effects of

errors inherent in this system, both

deterministic and random in nature.

[Contact: (303) 497-3538]

Laug, O.B., Stenbakken, G.N., and Leedy,

T.F., Electrical Performance Tests

for Audio Distortion Analyzers, NBS

Technical Note 1219 (January 1986).

Electrical performance test procedures

for audio distortion analyzers were developed by the National Bureau of

Standards for the U.S. Army Communications-Electronics Command. The report

provides detailed, step-by-step test

procedures that are based on specifications supplied by the Army for purposes

of evaluating audio distortion analyzer

bid samples. Examples of data sheets

and tables are also provided for recording interim and final results.

The report discusses the philosophy of

each measurement procedure with a view

toward providing an understanding of the

basic metrology required to perform the

measurements. In addition, the sources

of measurement error are discussed. The

primary applications and basic principles of modern audio distortion analyzers are also presented.

[Contact: (301) 921-2727]

Lawton, R.A., Riad, S.M., and Andrews,

J . R. , Pulse and Time-Domain Measurements, Proceedings of the IEEE,

Special Issue on Radio Measurement

Methods and Standards, Vol. 74, No. 1,

pp. 77-81 (January 1986).

A review of the state-of-the-art and

science of pulse parameter measurements

is given including recent advances in

the use of real-time oscilloscopes,

waveform recorders, equivalent time

sampling oscilloscopes, and countertimers in the measurement of repetitive

and single transient signals. Recent

advances in the use of artifact waveform

standards and modern signal analysis

techniques to compensate for measurement

distortion are highlighted. The formation and progress of an IEEE committee

which is developing a performance standard for waveform recorders is also

described.

[Contact: (303) 497-3339]

Cryoelectronic Metrology

Hamilton, C.A., Kautz, R.L. , and Lloyd,

F.L., A Josephson Series Array Voltage Standard at One Volt, NCSL 1985

Workshop & Symposium, Boulder, Colorado, July 1 5-18, 1985, pp. 71-77.

Josephson voltage standards have long

been limited by their low 1- to 1 0-mV

output level. A new method for operating 1 000 or more Josephson junctions in

series has produced a practical standard

at the 1 -V level. The junction array is

in the form of a microstrip which is

finline coupled to a waveguide at one

end and is terminated at the other end.

The whole circuit is fabricated on a (6xl2)-mm silicon substrate. With applied radiation at 72 GHz, the junction

array produces up to 8000 quantized

levels at the voltages nhf/2e. (In the

U.S. 2e/h has an assigned value of

483593.420 GHz/VNB g.) By selecting the level, n, and fine tuning the

frequency, f, any voltage from 0.1 to

1.2 V can be obtained. The high output

voltage eliminates the need for a voltage divider and greatly reduces errors

due to thermal voltages. When fully

evaluated, the new standard is expected

to have a precision of a few parts per

billion.

[Contact: (303) 497-3740]
Page 6 CEEE Technical Publication Announcements - November 86

Cr yoelectronic Metrology ,, cont'd.

Hamilton, C.A., Kautz, R.L., Lloyd,

F.L. , and Steiner, R.L. , A Practical

Josephson Voltage Standard at 1 V,

IEEE Electron Device Letters, Vol.

EDL-b, No. 12, pp. 623-625 (December

1 985) .

A series array of 1484 pairs of Joseph- son junctions biased by microwaves at 72

GHz is demonstrated to provide stable

quantized voltages at the 1 -V level.

The niobium/lead-alloy junctions used in

the array are not affected by thermal

cycling.

(Contact: (303) 497-3740]

Kautz, R.L. , and Macfarlane, J.C., Onset of Chaos in the rf-Biased Josephson

Junction, Physical Review A, Vol. 33,

No. 1, pp. 498-509 (January 1986).

The onset of chaos in the radiofrequency-biased (rf-biased) Josephson junction

is studied through numerical simulations. It is shown that the chaotic

region predicted by the method of

Melnikov spans only a narrow region of

rf amplitudes and consists of weakly

chaotic solutions which maintain phase

lock with the rf bias. The experimentally observed threshold of chaos is

shown to coincide with the onset of

unlocked chaotic behavior at higher rf

amplitudes.

[Contact: (303) 497-3991 or -3988]

Raisanen, A.V. , McGrath, W.R., Richards,

P.L. , and Lloyd, F.L. , Broad-Band RF

Match to a Millimeter-Wave SIS QuasiParticle Mixer, IEEE Transactions on Microwave Theory and Techniques, Vol.

MTT-33, No. 12, pp. 1 495-1 500 (December

1 985) .

An integrated superconducting microstrip

is shown to be a convenient, flexible,

and well-characterized matching element

for a superconductor-insulator-superconductor (SIS) quasi-particle heterodyne mixer. The resonant interaction

(Fiske modes) between the Josephson

oscillations of a voltage-biased junction and the microstrip provides a con- venient method for determining the electrical length of the microstrip line.

An open-circuited microstrip stub that

reflects a parallel inductance across

the junction is used to broaden the

bandwidth of the radiofrequency match of

a 30- to 40-GHz SIS mixer. Measurements

with Pb-alloy junctions in a full-height

wavelength mixer with fixed mechanical

tuning give an instantaneous bandwidth

of 10 to 15 percent with a double sideband mixer noise temperature Tm(DSB) =

1 0 ± 2. 5 K.

[Contact: Frances L. Lloyd (303) 497-

3254]

Antenna Metrology

Lewis, R.L., and Newell, A.C., An

Efficient and Accurate Method for

Calculating and Representing Power

Density in the Near-Zone of Microwave

Antennas, NBSIR 85-3036 (December

1985) .

An algorithm is presented for

calculating near-zone and Fr esnel-region

fields in front of microwave antennas

from discrete numerical values of the

radiated plane-wave spectrum (complex

far-field pattern) . That is, the near

fields are calculated by numerically

integrating the plane-wave spectrum

representation of the field. The crux

of the analysis consists of handling a numerical instability which arises from

integrating discrete data. A criterion

is developed for limiting the

integration domain in order to exclude

highly oscillatory regions of the

integrand. In turn, this leads to

restricting the applicable output range over which the field can be computed.

With the numerical instability problem

thus resolved, fast Fourier transform

techniques are used to assure efficient

numerical integration over a large (but

restricted) output range. The results

are conveniently presented as relative

power-density contours in planes formed

by the longitudinal coordinate axis and
CEEE Technical Publication Announcements - November 86 Page 7

Antenna Metrology , cont'd.

one transverse coordinate axis. The

algorithm is capable of extremely high

accuracy, which is demonstrated by

comparing predicted and measured near- fields for two distinct antennas, along

with a comparison against an exact

theoretical model. In the case of

circularly symmetric excitation models

for electrically large antenna

apertures, the predicted relative

near-zone power-density contour plots

turn out to be a function of only the

relative aperture distribution.

Nomographs for obtaining absolute

near-zone power densities are presented

for a few typical aperture-distribution

f unctions.

[Contact: (303) 497-5196]

Muth, L. A., Interelement Interactions

in Phased Arrays: Theory, Methods of

Data Analysis, and Theoretical Simulations, NBS Technical Note 1091

(December 1985).

We review theoretically the effects of

multiple reflections and mutual imped- ances in array environments and study

possible methods of far-field pattern

data analysis to recover interaction

effects. We use theoretical expressions

derived earlier to calculate in a twoelement linear array the mutualimpedance matrix and effective excitations of elements as functions of interelement separation and n max , the

maximum mode number in the radiation

pattern of the elements. Generalizations to two- and three-dimensional

arrays are discussed.

[Contact: (303) 497-3603]

Newell, A.C., Stubenrauch, C.F., and

Baird, R.C., Calibration of Microwave

Antenna Gain Standards, Proceedings

of the IEEE, Special Issue on Radio

Measurement Methods and Standards, Vol.

74, No. 1, pp. 1 29-1 32 (January 1986).

Techniques for precision calibration of

microwave antenna gain standards are

described with discussions of applicability and associated uncertainties.

Included are the three-antenna, extrapolation, swept-f requency , and near-field

techniques.

[Contact: (303) 497-3743]

Yaghjian, A.D., and Wittmann, R.C., The

Receiving Antenna as a Linear Differential Operator: Application to Spherical Near-Field Scanning, IEEE Transactions on Antennas and Propagation,

Vol. AP-33, No. 11, pp. 1 1 75-1 1 85 (November 1 985) .

The general receiving antenna is represented as a linear differential operator

converting the incident field and its

spatial derivatives at a single point in

space to an output voltage. The differential operator is specified explicitly

in terms of the multipole coefficients

of the antenna' s complex receiving pattern. When the linear operator representation is applied to the special

probes used in spherical near-field

measurements, a probe-corrected spherical transmission formula is revealed

that retains the form, applicability,

and simplicity of the nonprobe-corrected

equations. The new spherical transmission formula is shown to be consistent

with the previous transmission formula

derived from the rotational and translational addition theorems for spherical

waves.

[Contact: Ronald C. Wittmann (303)

497-3326]

Noise Metrology

Wait, D.F., The Impact of Automation

on NBS Noise Temperature Measurements,

Proceedings of the IEEE, Special Issue on Radio Measurement Methods and

Standards, Vol. 74, No. 1, pp. 117-120

(January 1 986) .

The accuracy of calibrating a thermal

noise source using the National bureau

of Standards' automated radiometer and

cryogenic primary noise standards is

typically ±2 percent, compared with ±3
Page 8 CEEE Technical Publication Announcements - November 86

Noise Metrology , cont'd.

percent for corresponding services that

used manual radiometers and hot primary

standards. Using the automated

radiometer, a noise source can typically

be calibrated at three frequencies in

the time a manual radiometer requires to

calibrate one. The automated radiometer

contains a six-port ref lectome ter, and

noise sources with reflection

coefficients as great as 0.3 can be

tolerated without significantly

affecting the calibration accuracy.

This makes it practical to use a single

broad-band, coaxial noise standard from

0.03 to 14 GHz. The six-port

ref lectome ter also makes it possible to

calibrate sources with connectors

different from those of the primary

standard with almost no additional

degradation in accuracy.

[Contact: (303) 497-3610]

Microwave Metrology

Hoer, C.A., Multiple Network

Analyzers, McGraw-Hill Yearbook of

Science and Technology, pp. 289-292

(1 986) .

This section discusses the theoretical

basis and operational considerations for

multiport network analyzers, which are linear passive microwave networks used

to measure complex reflection

coefficient and power. Methods for

measuring these quantities at a fixed

frequency have long been known and use,

for instance, bridge or slotted-line

techniques. In recent years very

wide-band systems (covering perhaps a

1 0: 1 range of frequency) have been

developed. To make measurements on such

systems one frequency at a time by

manual methods is prohibitively

time-consuming. Automatic network

analyzers, using wide-band tunable

sources and receivers under computer

control, have been developed, enabling

measurements to be made more rapidly.

They are, however, complex and

expensive, and more recently the use of

multiport couplers has resulted in

simpler systems.

[Contact: (303) 497-3705]

Hoer, C.A., Summary of the NBS Calibration Services and Systems, Proceedings of the IEEE, Special Issue on Radio Measurement Methods and Standards, Vol. 74, No. 1, pp. 32-35 (January 1 986)

.

This paper gives a brief summary of the

calibration services available at the

National Bureau of Standards for attenuation, phase shift, impedance, power,

and voltage at radiofrequency and microwave frequencies.

[Contact: (303) 497-3705]

Judish, R.M., Quality Control of Measurements - Measurement Assurance,

Proceedings of the IEEE, Special Issue

on Radio Measurement Methods and

Standards, Vol. 74, No. 1, pp. 23-25

(January 1 986) . The ability to relate individual mea- surements to nationally accepted standards is a requirement of traceability.

This paper discusses a perspective in

which the goals of traceability are viewed in terms of performance requirements on measurement quality as re- flected in a statement of uncertainty.

[Contact: (303) 497-3380]

Kamper, R.A., Uncertainty Charts for

RF and Microwave Measurements,

Proceedings of the IEEE, Special Issue

on Radio Measurement Methods and

Standards, Vol. 74, No. 1, pp. 27-32

(January 1 986) . The scope of the calibration services

for electrical quantities in the range

of frequency from 0 to 100 GHz that are

available from the National Bureau of

Standards is discussed briefly in a historical context. Some plans for

improved services that will be available

in the near future are noted. Charts

showing the variation of uncertainty

with magnitude over the full range of

the respective calibration services are presented.

[Contact: (303) 497-3535]
CEEE Technical Publication Announcements - November 86 Page 9

Microwave Metrology , cont'd.

Kamper, R.A., Uncertainty Charts for

RF and Microwave Measurements,

Proceedings of the IEEE, Special Issue on Radio Measurement Methods and

Standards, Vol. 74, No. 1, pp. 27-32

(January 1 986) . The scope of the calibration services

for electrical quantities in the range

of frequency from 0 to 100 GHz that are

available from the National Bureau of

Standards is discussed briefly in a historical context. Some plans for

improved services that will be available

in the near future are noted. Charts

showing the variation of uncertainty

with magnitude over the full range of

the respective calibration services are

presented.

[Contact: (303) 497-3535]

Reeve, G.R., and Miller, C.K.S., Current NBS Metrology Capabilities and

Limitations at Millimeter Wave Frequencies, Precision Measurements Association Newsnotes (9681 Business Center

Drive, Rancho Cucamonga, CA 91730),

Vol. II, pp. 55-67 (1 985).

The National Bureau of Standards (NBS)

establishes national artifact standards

and provides a metrology base for U.S.

industry and technology. NBS has not

established all of the required metrology in the millimeter-wave frequency

range to meet the needs of industry or government for this technology. This

paper describes the technical demands of

responding to the metrological challenges posed by mi 1 lime ter-wave technology. A description of current capabilities at NBS is given for those parameters and frequencies where measurement services exist. Ihe physical basis

for selected novel standards, such as the 94-GHz thermal noise standard, is

described to illustrate the changes

required from lower frequency designs

and the challenges that had to be overcome. Limitations in services and in

concepts of standards for providing

these services are described to indicate

the degree of research that must be

undertaken to satisfy future industrial

needs in this evolving technology.

[Contact: (303) 497-3557]

Sladek, N.J. , and Jesch, R.L. , Standardization of Coaxial Connectors in

the 1BC, Proceedings of the IEEE,

Special Issue on Radio Measurement

Methods and Standards, Vol. 74, No. 1,

pp. 14-18 (January 1986).

This paper reviews the requirements and

standardization of coaxial connectors in

the United States. It details the standardization of coaxial connectors within

the International Electrotechnical Commission (I EC) Subcommittee SC4 6D "Connectors for RF Cables." A list of published I EC connector standards and a list of I EC standards under consideration are included.

[Contact: Robert L. Jesch (303)

497-3496]

Weidman, M., Finline Diode Six-Port:

Fundamentals and Design Information,

NBS Technical Note 1090 (December

1 985) .

The preliminary design and testing of a planar circuit six-port having diode

detectors is described. The planar

circuit medium was chosen to be finline,

and all preliminary work was done in

WR-42 waveguide (18 to 26.5 GHz). The

finline substrate was alumina, and

initially commercial beam-lead diodes were bonded to the finline metallization. The goal is to design an integrated circuit which could be fabricated

on one chip (with diode detectors) and

used as part of a six-port network analyzer in the waveguide bands above 18

GHz. Initial designs proved to be un- satisfactory because of high losses and

reflections. Most of the problems have

been solved, and a usable integrated

finline circuit is a good possibility

for a millimeter wave six-port.

[Contact: (303) 497-3210]
Page 1

0

CEEE Technical Publication Announcements - November 86

Laser Metrology

Case, W.E., and Sanders, A. A., Laser

Power and Energy Measurements and the

NBS Laser Measurement Assurance Program

(MAP) , Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Tampa, Florida, March

20-22, 1985, pp. 281-285.

This paper describes the national standards for laser power and energy mea- surements maintained by the National

Bureau of Standards and how the measurement services based on these standards

are dissaninated. Particular emphasis

is devoted to the procedures and instrumentation used in these measurements.

The Laser Measurement Assurance Program

(MAP) is discussed in detail. The paper

also presents a detailed procedure for

the user to choose proper instrumentation and procedures to implement a mea- surements program in the laboratory.

[Contact: Aaron A. Sanders (303)

497-5341

]

Johnson, E.G. , Jr. , Direct Measurement

of the Electric Field of a Laser PulseTheory , NBS Technical Note 1084

( August 1985) .

We consider realizing an electric field

measuring apparatus by using optical

processing, tapered optical fibers, and

a pair of detectors at the end of each

optical fiber. Using an appropriate

computer-generated optical filter, we show it is possible to discriminate

among a set of orthonormal modes used to

represent the spatial features of the

electric field with a signal- to-noise

ratio of at least 1 00 to 1 . If the

positioning accuracies for various parts

of the apparatus are properly set up, it

is expected that the signal- to-noise

ratio could be about 1 000. The purpose

of the tapered and graded-index fibers

is to select the fundamental propagating

mode in a fiber and to attenuate the

other modes. The existence of these

fibers allows the precise determination

of the strength of each of the orthonormal modes being used as the spatial

basis of the electric field before the

optical processing. The detectors then

measure the strength of each fundamental

mode. There are 36 such modes for the

apparatus under discussion--six for the

x-dimension and six for the y-dimension.

Propagation of the laser pulse is as- sumed to be along the z-axis. We use

two detectors for each mode so that the

polarization is determined.

This paper presents the conflicts in the

design and gives a solution. The com- plete evaluation requires assembly of

the proposed apparatus to assess final

accuracy

.

[Contact: (303) 497-3234]

Rasmussen, A.L., and Sanders, A. A.,

Documentation of the NBS APD and PIN

Calibration Systems for Measuring Peak

Power and Energy of Low-Level 1.064 tun Laser Pulses, NBSIR 85-3032 (December

1985) .

National Bureau of Standards APD (avalanche) and PIN silicon photodiode

transfer standards are documented for a calibration service to measure 1.064-)jm

laser pulses from ~10~® to ~10-t+ W peak

power and ~ 10_ -*-6 to ~10- ^ J energy. A

modulated cw (continuous-wave) measure- ment system generating known low-level

pulses is described. Calibration support equipment, systematic and random

errors, and computer programs and calibration data are also described.

[Contact: (303) 497-5367 or -3616]

Rasmussen, A.L. , and Sanders, A. A.,

Transfer Standards for Energy and Peak

Power of Low-Level 1.064 Micrometer

Laser Pulses and Continuous Wave Laser

Power, Optical Engineering, Vol. 25,

No. 2, pp. 277-285, (February 1986).

For the first time, traceable transfer

standards have been developed for mea- suring 1.064-)jm laser pulses with duration of about 10 to 100 ns, peak power

density of about 1

0

- ® to 1 0~^ W/cm 2

, and

energy density of about 10 -1 ^ to 1 0“ 1 * J/cm2

. These power and energy transfer

standards use avalanche (APD) and PIN
CEEE Technical Publication Announcements - November 86 Page 1

1

Laser Metrology , cont'd.

silicon photodiode detectors, respectively. They are stable and have total

uncertainties of about 10%. The system

for calibrating them and other devices

consists of a cw (continuous-wave)

Nd : YAG laser beam acousto-optically

modulated to provide low-level laser

pulses of known peak power and energy.

With pulse height analyzer readout, the

PIN transfer standard system records

each pulse, from which the mean pulse

energy and laser stability may be

evaluated. With integrating voltmeter

readout, this system can measure energy

or average power. These pulsed and cw measurement techniques can be extended

to the visible and other near-infrared

wavelengths.

[Contact: (303) 497-5367 or -3616]

Simpson, P.A. and Sanders, A. A., Pulse

Considerations for Low-Level Laser

Receivers, to be published in the

Proceedings of the Measurement Science

Conference, Irvine, California, January

22-24, 1986.

Laser target designators and rangefinders use low-level receivers to detect

the light reflected from the target.

Present testing procedures for the

receivers often use the measurement of

the total energy of a light pulse which

is generated with a pulsed LED (lightemitting diode). These procedures can

be subject to significant error unless

certain precautions are observed. Two new fast detectors of pulse shape with

high sensitivity and extended wavelength

range are described. These detectors

can be used with low-level transfer

standards for next generation laser

target designator and rangefinder systems . [Contact: (303) 497-3789]

Optical Fiber Metrology

Danielson, B.L. , Optical Time-Domain

Reflectometer Specifications and Performance Testing, Appl. Optics, Vol.

24, No. 15, pp. 2313-2322 (August 1,

1 985) .

From a researcher's as well as a user's

point of view, it is highly desirable to

adopt a common basis for specifying

optical time-domain reflec tome ter performance parameters. This paper proposes some procedures and test methods

which permit these devices to be characterized in a consistent way. Passive

test fixtures are also described which

may facilitate measurements of dynamic

range and other ref lectome ter properties (the ref lectome ters addressed in

this paper are used to characterize

optical fibers and fiber installations) . [Contact: (303) 497-5620]

Day, G.W., McFadden, J.D.O. , Veeser,

L.R., Chandler, G. I . , and Cernosek,

R.W., Optical Fiber Sensors for the

Measurement of Pulsed Electric Currents, NATO AGARD Conference, Guided

Optical Structures in the Military

Environment, Istanbul, Turkey, Sept.

23-27, 1985, Preprint 383, pp. 8-1 to

8-9.

Recent progress in the design of fiber sensors for pulsed electric currents is

reviewed. Several of the most useful

sensor configurations are described and

compared. Models are used to predict

the transfer function of these sensors,

their sensitivity to non-ideal fiber

properties, particularly linear birefringence, and methods for overcoming

these problems. Other recent research

is examined to suggest the prospect for

sensors with improved sensitivity and

s tability.

[Contact: (303) 497-5204]

Franzen, D.L., Determining the Effective Cutoff Wavelength of Single-Mode

Fibers: An Interlaboratory Comparison, Journal of Lightwave Technology,

Vol. LT-3, No. 1, pp. 1 28-1 34 (February

1 985) .

The National Bureau of Standards, in

cooperation with the Electronic

Industries Association, conducted an interlaboratory measurement comparison

among six fiber manufacturers to deter-
Page 1

2

CEEE Technical Publication Announcements - November 86

Optical Fiber Metrology , cont'd.

mine the eifective cutoff wavelength of

single-mode fibers. Measurement techniques based on transmitted power were used to determine cutoff wavelength on

four fibers designed for single-mode

operation at 1 300 nm. NBS also con- tributed results using a spectral near- field technique. One- standard-deviation

measurement spreads for the various

techniques range from 6 to 1 2 nm. With

the appropriate data analysis, singlebend attenuation and power-step methods

give the same results. Both techniques

are easily implemented as extensions to

the usual spectral attenuation measurement.

[Contact: (303) 497-3346]

Franzen, D.L., An Interlaboratory

Measurement Comparison Among Fiber

Manufacturers to Determine the Effective Cut-Off Wavelength and Mode Field

Diameter of a Single Mode Fiber,

Technical Digest of the Conference on Optical Fiber Communication and the 3rd

International Conference on (Optical

Fiber Sensors, San Diego, California,

February 1 1-14, 1985, p. 36.

An inter laboratory measurement comparison to determine an effective cutoff

wavelength and mode field diameter of a single-mode fiber was conducted by the

National Bureau of Standards in cooperation with the Electronic Industries

Association (EIA). Participants included NBS, several U.S. manufacturers,

and some foreign laboratories. The

purpose of the comparisons was to gather

information on interlaboratory agreement

when the same measurement techniques are

used and to determine offsets between

different techniques. The various procedures tested (three transmission methods for determining cut-off wavelength

and four methods [transverse offset,

near-field, far-field, and variable

aperture far-field] for determining mode

field diameter) are currently pending

before the EIA and represent current

practice for manufacturers. Interlaboratory agreement and systematic offsets

between methods are discussed,

[Contact: (303) 497-3346 or -5342]

Franzen, D.L. , and Day, G.W., Fiber

Optics Emphasis on Single Mode - Conference Report, NBS Journal of

Research, Vol. 9, No. 1, p. 49

( January-February 1 985).

The third biennial Symposium on Optical

Fiber Measurements, sponsored by NBS in

cooperation with the IEEE Optical

Waveguide Communications Committee and

the Optical Society of America, drew

some 300 attendees to Boulder October

2-3, 1984 to hear 25 contributed papers,

several invited papers, and to attend

two workshops on the general subject of

optical fiber measurements. This short

note identifies several highlights of

the Symposium.

[Contact: (303) 497-3346 or -5342]

Franzen, D.L., and Srivastava, R.,

Determining the Mode-Field Diameter of

Single-Mode Optical Fiber: An Interlaboratory Comparison, Journal of

Lightwave Technology, Vol. LT-3, No.

5, pp. 1 073-1 077 (October 1985).

The National Bureau of Standards, in

cooperation with the Electronic Industries Association, conducted an interlaboratory measurement comparison among

fiber manufacturers. , Evaluated were transverse splice offset, near-field,

far-field, and variable aperture farfield methods for determining mode-field

diameter. Measurements were performed

on five single-mode fibers at both 1300-

and 1 550-nm wavelengths. At 1 300 nm, agreement was fairly good with the average one standard deviation being 0.15 ym

for mode-field diameters in the 8- to

1 1 -ym range. Distinct systematic differences among various techniques were observed at 1 550 nm where mode distributions are not as Gaussian.

[Contact: (303) 497-3346 or -5342]

Maisonneuve, J.M., Churoux, P. , and

Gallawa, R.L., Dse of Mode Transfer

Matrices in L.A.N. Loss Evaluation,

Proc. SPIE - International Society of
CEEE Technical Publication Announcements - November 86 Page 1

3

Optical Fiber Metrology , cont'd.

Optical Engineering (P.0. Box 10, Bellingham, WA 98227-0010), Vol. 559, pp.

1 82-185 (1 985) [Conference, San Diego,

California, August 19-23, 1985].

A method using Mode Transfer Matrices

to characterize step-index fiber

components and predict local area network (LAN) power budget is presented.

The results show this method is well

adapted to describing modal power distribution variations.

[Contact: Robert L. Gallawa (303) 497-

3761]

Shao, Y. , Alvarez, R., Weimer, C., and

Gallawa, R.L. , Pulse Spectrum Analysis Method of Measuring Fiber Bandwidth, Proc. SP IE - The International

Society for Optical Engineering (P.0.

Box 10, Bellingham, WA 98227-0010),

Vol. 559, pp. 207-210 [Conference, San

Diego, California, August 1 9-23, 1 985].

A system for measuring optical fiber

bandwidth utilizing the pulse spectrum

analysis method (PSA) has been established. This paper discusses problems

inherent to that system such as signalto- noise ratio and off-peak error.

Included are the results of bandwidth

measurements for telecommunication grade

fibers. Finally, the PSA method is

compared to other bandwidth measurement

methods.

[Contact: Robert L. Gallawa (303) 497-

3761]

Shao, Y. , and Gallawa, R.L., Some

Issues in Optical Fiber Bandwidth Measurements, Proceedings of the IEEE

Instrumentation and Measurement Technology Conference, Tampa, Florida,

March 20-22, 1985, pp. 228.

The measurement of optical fiber bandwidth, using methods in common use in

the fiber community, is discussed along

with difficulties and variabilities

encountered.

[Contact: Robert L. Gallawa (303) 497-

3761]

Other Fast Signal Topics

Judish, R.M., Quality Control of

Measurements - Measurement Assurance,

Proceedings of the IEEE, Special Issue

on Radio Measurement Methods and

Standards, Vol. 74, No. 1, pp. 23-25

(January 1986).

The ability to relate individual

measurements to nationally accepted

standards is a requirement of

traceability. This paper discusses a perspective in which the goals of

traceability are viewed in terms of

performance requirements on measurement

quality as reflected in a statement of

uncertainty.

[Contact: (303) 497-3380]

Kamper, R.A., Uncertainty Charts for

RF and Microwave Measurements,

Proceedings of the IEEE, Special Issue

on Radio Measurement Methods and

Standards, Vol. 74, No. 1, pp. 27-32

(January 1 986) . The scope of the calibration services

for electrical quantities in the range

of frequency from 0 to 100 GHz that are available from the National Bureau of

Standards is discussed briefly in a historical context. Some plans for

improved services available in the near

future are noted. Charts showing the

variation of uncertainty with magnitude

over the full range of the respective

calibration services are presented.

[Contact: (303) 497-3535]

Ku, H.H., and Judish, R.M., Fundamentals of Error Analysis, Proceedings

of the IEEE, Special Issue on Radio

Measurement Methods and Standards, Vol.

74, No. 1, pp. 25-27 (January 1986).

This paper discusses the process of

assessing the uncertainty of measurement

results through error analysis. We

restrict the discussion to sources of

errors, measurement errors, modeling

errors, and calibration errors in the

context of physical experiments.

[Contact: Robert M. Judish (303) 497-

3496]
Page 1

4

CEEE Technical Publication Announcements - November 86

Other Fast Signal Topics , cont'd.

Sladek, N.J. , and Jesch, R.L., Standardization of Coaxial Connectors in

tbe I EC, Proceedings of the IEEE,

Special Issue on Radio Measurement

Methods and Standards, Vol. 74, No. 1,

pp. 14-18 (January 1986).

This paper reviews the requirements and

standardization of coaxial connectors in

the United States. It details the standardization of coaxial connectors within

the International Electrotechnical Commission (IEC) Subcommittee SC46D "Connectors for RF Cables." A list of published IEC connector standards and a list of IEC standards under consideration are included.

[Contact: Robert L. Jesch (303) 497-

3 496]

Er ratum

The wrong abstract appeared in the June

1 986 issue of the Technical Progress

Bulletin [NBSIR 86-3344-2] for the

following published paper. The correct

abstract follows the citation.

Young, M., The Scratch Standard is

Only a Cosmetic Standard, Laser

Focus/ Elec tro-Op tics , pp. 138-140

(November 1985). [An identical paper

appeared in the Proceedings of the

Conference on Laser Induced Damage in

Optical Materials, Boulder, Colorado,

October 28-30, 1 985. ]

In this paper, I present a history of

the scratch and dig standard and show

that this standard has since its

inception been recognized as a cosmetic

standard and not as an objective or performance standard. In addition, I attempt to dispel the myth that the

scratch standard was changed during the

1 960s and show that scratch number

cannot be related to scratch width.

Finally, I describe a preliminary

experiment that suggests that the

scratch standards have not aged with

time and are, in fact, extremely

s table.

[Contact: (303) 497-3223 or -5342]

ELECTRICAL SYSTEMS

Power Systems Metrology

FitzPatrick, G.J., Forster, E.O.,

Kelley, E.F., and Hebner, R.E.,

Streamer Initiation in Liquid Hydrocarbons , 1985 Annual Report, IEEE

Conference on Electrical Insulation and

Dielectric Phenomena, Amherst, New

York, Oct. 20-24, 1985, pp. 27-32.

Using 93X magnification and a framing

rate of 2 x 10 7 frames/s, the initiation

of prebreakdown streamers in toluene,

isooctane, and a white oil has been

photographed. The initial growth from a negative point electrode was a thin

pencil-like structure, having a growth

rate of 2 to 3 x 1 0

4 cm/s, which subsequently branched into a tree-like structure. Positive streamers were found to

develop into a more filamentary structure than negative streamers. Under

nominally identical conditions, a positive streamer may grow, then disappear;

may grow to bridge the gap; or may grow

to a certain length, then persist.

Contact: Robert E. Hebner (301 ) 921-

3121]

Fulcomer, P.M., NBS Ambient Magnetic

Field Meter for Measurement and Analysis of Low-Level Power Frequency Magnetic Fields in Air, NBSIR 86-3330

(December 1 985)

.

This report describes a portable,

battery-powered magnetic fieldmeter

which has been developed to provide

improved accuracy in the measurement and

analysis of low-level and ambient powerfrequency magnetic fields. Accurate

measurement of such fields is becoming

increasingly important as public concern

grcws over the possibility that exposure

to such fields may produce effects on human health. Included in the report

are a description of the instrumentation, a circuit analysis, a discussion

of the calibration procedures together

with an uncertainty analysis, and some sample measurement results. The instrumentation enables measurement of power-
CEEE Technical Publication Announcements - November 86 Page 1

5

Power Systems Metro log y , cont' d.

frequency magnetic field in air with an overall uncertainty of less than one percent over a range from 50 nanotesla

(500 microgauss) to 200 microtesla

(2 gauss) and an overall uncertainty of

less than two percent down to 2 nanotesla (20 microgauss). It also enables the

percentage of each harmonic present in

the field to be determined to an uncertainty of less than three percent.

[Contact: (301 ) 921-3121]

Hebner, R.E. , Research for Electric

Energy Systems — An Annual Report,

NBSIR 86-3316 (March 1986).

This report documents the technical

progress in the five investigations

which make up the project "Support of

Research Projects for Electrical Energy

Systems," Department of Energy Task

Order Number 137, funded by the U.S.

Department of Energy's Office of Energy

Systems Research and performed in the

Electrosystems Division of the U.S.

National Bureau of Standards.

[Contact: (301) 921-31 21]

Kamper, R.A., Uncertainty Charts for

RP and Microwave Measurements,

Proceedings of the IEEE, Special Issue

on Radio Measurement Methods and

Standards, Vol. 74, No. 1, pp. 27-32

(January 1 986) .

The scope of the calibration services

for electrical quantities in the range

of frequency from 0 to 100 GHz that are available from the National Bureau of

Standards is discussed briefly in a historical context. Some plans for

improved services that will be available

in the near future are noted. Charts

showing the variation of uncertainty

with magnitude over the full range of

the respective calibration services are

presented.

[Contact: (303) 497-3535]

Pulse Power Metrology

Day, G. W., McFadden, J.D.O. , Veeser,

L.R., Chandler, G. I . , and Cernosek,

R . W . , Optical Fiber Sensors for the

Measurement of Pulsed Electric Currents, NATO AGARD Conference, Guided

Optical Structures in the Military

Environment, Istanbul, Turkey, Sept.

23-27, 1 985, Preprint 383, pp. 8-1 to

8-9.

Recent progress in the design of fiber

sensors for pulsed electric currents is

reviewed. Several of the most useful

sensor configurations are described and

compared. Models are used to predict

the transfer function of these sensors,

their sensitivity to non-ideal fiber

properties, particularly linear birefringence, and methods for overcoming

these problems. Other recent research

is examined to suggest the prospect for sensors with improved sensitivity and

stability.

[Contact: (303) 497-5204]

Magnetic Materials and Measurements

Fulcomer, P.M., MBS Ambient Magnetic

Field Meter for Measurement and Analysis of Low-Level Power Frequency Magnetic Fields in Air, NBSIR 86-3330

(December 1985).

This report describes a portable,

battery-powered magnetic fieldmeter

which has been developed to provide

improved accuracy in the measurement and

analysis of low-level and ambient powerfrequency magnetic fields. Accurate

measurement of such fields is becoming

increasingly important as public concern

grows over the possibility that exposure

to such fields may produce effects on human health. Included in the report

are a description of the instrumentation, a circuit analysis, a discussion

of the calibration procedures together

with an uncertainty analysis, and some sample measurement results. The instrumentation enables measurement of powerfrequency magnetic field in air with an

overall uncertainty of less than one percent over a range from 50 nanotesla

(500 microgauss) to 200 microtesla

(2 gauss) and an overall uncertainty of
Page 1

6

CEEE Technical Publication Announcements - November 86

Magnetic Materials, etc. , cont'd.

less than two percent down to 2 nanotesla (20 microgauss). It also enables the

percentage of each harmonic present in

the field to be determined to an uncer- tainty of less than three percent.

[Contact: (301 ) 921-3121]

Goldfarb, R.B., Rao, K. V. , and Chen,

H.S., New Magnetic Phase Diagram of

the Amorphous Pd-Fe-Si Ferroglass Alloy

System, Journal of Magnetism and

Magnetic Materials, Vol. 54-57, pp.

1 1 1-1 1 2 (1 986) .

The magnetic phase diagram of amorphous

Pdg g_xFe xSi

2 g is examined for values

of x between 5 and 22. We use the peak

in the imaginary component of ac susceptibility to determine the ferromagneticlike to spin-glass transition temperatures Tfg. It is found that the

Tfg curve is strongly field dependent and increases monotonically with

increasing Fe concentration, even around

x = 22.

[Contact: (303) 497-3650]

Superconduc tors

Fickett, F.R., Investigation of a Practical Superconductor with a Copper

Matrix, Annual Report and Final Summary

of Project 255, International Copper

Research Association (708 Third Avenue,

New York, NY 10017) (1985).

In this report we summarize the work

performed on four INCRA projects covering a span of about six years. The main

goal of the work was to investigate the

in-situ superconductors, those produced

by the relatively rapid cooling of a melt containing essentially non-miscible

components. The component with the

higher melting point precipitates out as small particles during the cooling.

Subsequent drawing of the resulting

boule results in fine filaments of this

material (the superconductor) in the

lower-melting matrix (usually oxygenfree copper or a copper-tin alloy).

[Contact: (303) 497-3785]

Goodrich, L.F., Minervini, J.V. , Clark,

A.F., Fickett, F.R., Ekin, J.W., and

Pittman, E.S., Development of Standards for Superconductors - Interim

Report, NBSIR 85-3027 (January

1 985) .

A cooperative program with the Department of Energy, the National Bureau of

Standards, and private industry is in

progress to develop standard measurement

practices for use in large-scale applications of superconductivity. The goal

is the adoption of voluntary standards

for the critical parameters and other

characterizations of practical superconductors. Progress for the period January 1982 through December 1983 is

reported. The major effort was the

procurement, selection, and certification of the first superconducting wire

for critical current measurements as a Standard Reference Material (SRM 1 457).

Other work reported here includes effect

of geometry on current transfer, lapjoint resistance, and ac losses.

[Contact: (303) 497-3143]

ELECTROMAGNETIC INTERFERENCE

Adams, J.W., and Vanzura, E. , Shielding Effectiveness Measurements of Plastics, NBSIR 85-3035 (January 1986).

Measurement of shielding effectiveness

of plastic materials with respect to

electromagnetic radiation poses serious

problems due to the insulating nature of

many plastics. A method of making these

measurements using a flanged coaxial

holder overcomes some of the difficulties.

[Contact: (303) 497-3328]

Kanda, M., Larsen, E.B., Borsero, M.,

Galliano, P.G. , Yokoshima, I., and

Nahman, N.S., Standards for Electromagnetic Field Measurements, Proceedings of the IEEE, Special Issue on Radio Measurement Methods and Standards, Vol. 74, No. 1, pp. 120-128

(January 1 986)

.

This paper describes the methodology for
CEEE Technical Publication Announcements - November 86 Page 1

7

Electromagnetic Interference , cont'd.

standard electromagnetic field measurements using anechoic chambers, open

sites, guided-wave structures, and

probes as transfer standards.

[Contact: (303) 497-5320]

Larsen, E.B., Calibration and Meaning

of Antenna Factor and Gain for EMI

Antennas, Directory and Design Guide

of the Control of EMI, Item 1986, pp.

114ff (1986) [Robar Industries, Inc.,

20 Clipper Road, West Conshohocken, PA

1 9428-2721] .

The National Bureau of Standards offers

a calibration service for field strength

meters and electromagnetic interference

(EMI) antennas in the frequency range of

10 kHz to 10 GHz. The antennas most

commonly used are loops for magnetic

fields from 10 kHz to 50 MHz, monopoles

for vertically polarized electric fields

from 30 kHz to 300 MHz, and dipoles or related antennas for electric fields

from 20 MHz to 10 GHZ. The majority of

calibrations consist of determining the

"antenna factor" (K) or "realized" gain

(G re ) , which permits the use of a

50-S2 receiver (tunable radiofrequency

voltmeter) with the calibrated antenna

to make measurements of radiated emissions. A receiver with attached antenna

can also be calibrated as a system to

measure the field strength directly.

There are three common independent techniques for calibrating an antenna to

make field strength measurements. These

are: (a) standard antenna method, (b)

standard field method, and (c) insertion

loss method. All three techniques lead

to a calibrated gain or antenna factor - which are related to each other in a reciprocal fashion. In practice, however, the gain of an antenna is most

commonly measured by comparing its output in a locally generated field to that

of a "standard" receiving antenna, whose

gain is accurately known. This approach

is called a "relative" gain measurement.

If the gain is determined without using

another antenna having known gain, the

procedure is called an "absolute" gain

measurement. The three techniques for

determining absolute gain and antenna

factor are described,

[Contact: (303) 497-3540]

Ma, M.T. , Kanda, M., Crawford, M.L. , and

Larsen, E.B., Measuring Electromagnetic Interference, Part Is Open-Field

Sites and TEM Cells, Test and Measurement World, pp. 72ff (February

1986) [condensation of a portion of A

Review of Electromagnetic Compatibility/Interference Measurement Methodologies, Proceedings of the IEEE, Vol.

73, No. 3, pp. 388-41 1 (March 1985)].

Measuring radiated electromagnetic power

is essential to demonstrate conformance

to various electromagnetic interference/compatibility ( EMI /EMC) regulations

and specifications. A number of methods

are available -- open-field sites,

transverse electromagnetic (TEM) cells,

reverberating chambers, and anechoic

chambers. Selection of a suitable technique requires a knowledge of the

strengths and limitations of each.

Proper interpretation of measured re- sults then requires an intimate knowledge of the characteristics of the

chosen site or facility.

Following a general introduction to the

subject of testing for EMI/EMC, this

first article in a three-part series

discusses 1) measurements and problems

using open-field sites and 2) measure- ments on small electrical equipment and

devices in TEM cells for radiated sus- ceptibility and radiated emission testing.

[Contact: (303) 497-3800]

Ma, M.T., and Koepke, G.H., Measurements of Unintentional Electromagnetic

Emissions, Proceedings of the IEEE,

Special Issue on Radio Measurement

Methods and Standards, Vol. 74, No. 1,

pp. 110-111 (January 1986).

A summary of a new method for determin-

* ing the radiation characteristics of

leakage from electronic equipment or
Page 1

8

CEEE Technical Publication Announcements - November 86

Electromagnetic Interference , cont'd.

other unintentional radiators of interference is presented. The theoretical

background and specific measurement

procedures for the method using a trans- verse electromagnetic cell are outlined.

The theory and measurements have been

verified in referenced work by the re- sults of a simulated theoretical example

and an experiment using a spherical

dipole radiator. A reference is also

given for mathematical analysis of the

uncertainties in the final, extracted

results when the experimental data are degraded by the background noise and

measurement imperfections.

[Contact: (303) 497-3800]

Phelan, R.J. , Jr., Larson, D.R., and

Simpson, P.A., A Sensitive, High

Frequency Electromagnetic Field Probe

Using a Semiconductor Laser in a Small

Loop Antenna, Proc. SPIE - International Society of Optical Engineering

(P.O. Box 10, Bellingham, WA 98227-

0010), Vol. 566, pp. 300-306 (1985)

[Conference, San Diego, California,

August 20-23, 1 985].

Using a loop antenna in series with a semiconductor laser, an optically

coupled electromagnetic field probe has

demonstrated sensitivities better than

3 pV/ (m»Hz 1 /2 ) . The outside dimensions

of the probe are equal to 5.7 x 5.7 x 1.3 cm^. It can be used to measure

fields with frequencies as high as 2 GHz. The dynamic range is estimated to

exceed 6 orders of magnitude for incident microwave powers.

[Contact: (303) 497-3696 or -5342]

Randa, J. , and Kanda, M., Directional

Scanning of Complex Electromagnetic

Environments, IEEE Transactions on Antennas and Propagation, Vol. AP-33,

No. 12, pp. 1413-1416 (December 1985)

[a shortened version of this paper

appeared in the Proceedings of the 1985

International Symposium on Antennas and

Propagation, Kyoto, Japan, August

20-22, 1985, pp. 899-902].

As radiofrequency and microwave sources

(both intentional and inadvertent) multiply, the electromagnetic (EM) environment in which electronic devices (and

people) must function becomes increasingly complicated, while at the same time its characterization becomes more

important. In order to completely characterize an EM environment without

knowledge of the radiating sources, the

sampling theorem requires that systematic measurements of the amplitude and

phase of the field be made throughout

the volume at spacings of no more than

one-half wavelength of the highest

frequency present. Implementing this

number of measurements is often

impossible and seldom convenient. There

is a need for practical techniques which

would determine useful properties of an

EM environment from relatively few mea- surements. One recent suggestion for

such a technique is to use directional

measurements at a single point in con- junction with a plane-wave expansion of

the field. This paper reports the formulation of the technique and the

results of a simulation using it.

[Contact: (303) 497-31 50]

Wilson, P.F., Adams, J.W., and Ma, M.T.

,

Measurement of the Electromagnetic

Shielding Capabilities of Materials,

Proceedings of the IEEE, Special Iissue

on Radio Measurement Methods and

Standards, Vol. 74, No. 1, pp. 112-115

(January 1 986)

.

Electromagnetic shielding is typically

measured in terms of insertion loss,

that is, the reduction in the fields

coupled between a transmitter and a receiver which results from interposing

the shield material. Although the

insertion loss concept is simply stated,

questions arise when one attempts to

interpret specific insertion loss

measurements. Insertion loss data

depend not only on the inherent

shielding effectiveness of the material,

but also on the antenna types used for

the measurement, the incident field

distribution, the sample size, a possible contact impedance between the
CEEE Technical Publication Announcements - November 86 Page 1

9

Electromagnetic Interference , cont'd.

test material and its mount, and other

factors. For a given sample of shield

material, varying these factors can lead

to a large range of possible measured

insertion loss values. Both the above

considerations and existing shielding

effectiveness measurement systems are discussed briefly in this paper. The

emphasis is on potential difficulties

encountered in making even relative

comparisons of results and on the

importance of understanding hew the

measurement system used affects the

data.

[Contact: (303) 497-3842]

ADDITIONAL INFORMATION

Lists of Publications

Gibson, K.A., Page, J. M., and Miller,

C.K.S., A Bibliography of the NBS

Electromagnetic Fields Division Publications, NBSIR 85-3040 (February

1 986) .

This bibliography lists publications of

the National Bureau of Standards' Electromagnetic Fields Division for the

period from January 1984 through September 1985, with selected earlier publications from the Division's predecessor

organizations.

[Contact: (303) 497-31 32]

Sorrells, J.R., Palla, J.C., and Meiselman, B., Electrical and Electronic

Metrology: A Bibliography of NBS Electrosystems Division's Publications,

NBS List of Publications 94 (January

1 986) .

This bibliography lists the publications

of the Electrosystems Division, Center

for Electronics and Electrical Engineering, NBS, and of its predecessor sec- tions for the period January 1968

through December 1985. A brief description of the Division's technical program

is given in the introduction.

[Contact: (301) 975-241 3]

Kline, K.E. , and DeWeese, M.E., Metrology for Electromagnetic Technology:

A Bibliography of NBS Publications,

NBSIR 86-3048 (June 1986).

This bibliography lists the publications

of the personnel of the Electromagnetic

Technology Division of NBS in the period

from January 1970 through December 1985.

A few earlier references that are directly related to the present work of

the Division are included.

[Contact: (303) 497-3678]

Walters, E.J. , Semiconductor Measurement Technology; List of Publications — 1962- 1984 , NBS List of Publications 72 (March 1985).

This list of publications contains re- ports of work performed at the National

Bureau of Standards in the field of

Semiconductor Measurement Technology in

the period from 1962 through December

1 984.

[Contact: (301) 975-2050]

RECENTLY ISSUED

STANDARD REFERENCE MATERIALS

The first practical superconducting

standard reference material (SRM) has

been released by the Electromagnetic

Technology Division to the NBS Office of

Standard Reference Materials for sale to

the public. The certified parameter of

SRM 1457, Superconducting Critical Current — NbTi Wire, is critical current

at magnetic fields of 2, 4, 6, and 8

tesla at a temperature of 4.2 K and an electric field criterion of 0.2 pV/cm.

Information is given to permit the user

to determine critical current for temperatures in the range 3.90 to 4.24 K

and electric field criteria from 0.05 to

0. 2 yV/cm.

SRM 1457 consists of a 2.2-m length of a multifilimentary, niobium-titanium,

copper-stabilized wire, wound in a single layer on a spool having a core diameter of 8.7 cm. The wire is evaluated

for 34 parameters relating to current,

voltage, magnetic field, temperature.
Page 20 CEEE Technical Publication Announcements - November 86

Recently Issued SRMs , cont'd.

strain, and physical specimen characteristics .

In conjunction with ASTM Standard Test

Method B714-82, D-C Critical Current of

Composite Superconductors, the new SRM

is intended to provide means for calibrating apparatus used to measure key

parameters of superconductor products

and thus should be useful to buyers and

sellers of superconductors, users of

superconducting equipment, and re- searchers in superconducting technology.

CEEE SPONSORS

National Bureau of Standards

Department of Defense

Defense Advanced Research Project

Agency; Combined Army/Navy/ Ai r Force

Calibration Coordination Group;

Defense Nuclear Agency

U.S. Air Force

Bolling Air Force Base; Hanscom Air

Force Base; Newark Air Force

Station; Rome Air Development

Center; Space Division;

Wr igh t-Patterson Air Force Base

U.S. Army

Aberdeen Proving Ground; Aviation

Research and Development Command;

Fort Monmouth; Harry Diamond

Laboratories; Fort Belvoir;

Redstone Arsenal

U.S. Navy

Aviation Logistics Center (Patuxent

River); Naval Air Systems Command;

Naval Surface Weapons Center; Naval

Weapons Support Center (Crane);

Office of Naval Research

Department of Energy

Energy Systems Research; Fusion

Energy

Department of Justice

Law Enforcement Assistance

Administration

Charles Stark Draper Laboratory

Food and Drug Administration

Hughes Aircraft Company

International Copper Research

Association

International Telecommunications

Satellite Organization

Sandia National Laboratories

University of California Los Alamos

Scientific Laboratory
NBS-114A (rev. 2-80

U.S. DEPT. OF COMM. BIBLIOGRAPHIC DATA

SHEET (See instructions)

1. PUBLICATION OR

REPORT NO.

NBSIR-86/3486

2. Performing Organ. Report No. 3. Publication Date November 1986

4. TITLE AND SUBTITLE

Center for Electronics and Electrical Engineering Technical Publication Announcements

Covering Center Programs, January-March 1986

5. AUTHOR(S)

E. Jane Walters, compiler

6. PERFORMING ORGANIZATION (If joint or other than NBS. see instructions) 7. Contract/Grant No. NATIONAL BUREAU OF STANDARDS

DEPARTMENT OF COMMERCE 8. Type of Report & Period Covered

WASHINGTON, D.C. 20234

9 . SPONSORING ORGANIZATION NAME AND COMPLETE ADDRESS (Street. City. State, Z/P)

U.S. Department of Commerce

National Bureau of Standards

National Engineering Laboratory

Center for Electronics and Electrical Engineering

10. SUPPLEMENTARY NOTES

All technical information included in this document has been previously approved for

publication.

Document describes a computer program; SF-185, FlPS Software Summary, is attached.

11. ABSTRACT (A 200-word or less factual summary of most significant information. If document includes a significant

bi bliography or literature survey, mention it here)

This is the eighth issue of a quarterly publication providing information on the

technical work of the National Bureau of Standards Center for Electronics and

Electrical Engineering. This issue of the Center for Electronics and Electrical

Engineering Technical Publication Announcements covers the first quarter of calendar

year 1986. Abstracts are provided by technical area for papers published this

quarter

.

12. KEY WORDS (Six to twelve entries; alphabetical order; capitalize only proper names; and separate key words by semicolon s) antennas; electrical engineering; electrical power; electromagnetic interference;

electronics; instrumentation; laser; magnetics; microwave; optical fibers; semiconductors; superconductors

13. AVAILABILITY

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| | For Official Distribution. Do Not Release to NTIS

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[X] Order From National Technical Information Service (NTIS), Springfield, VA. 22161

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PRINTED PAGES

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KEY CONTACTS:

Center Headquarters (720) Director, Mr. Judson C. French (301) 975-2220

Deputy Director, Mr. Robert I. Scace (301) 975-2220

Electrosystems Division (722) Chief, Dr. Oskars Petersons (301) 975-2400

Electromagnetic Fields Division (723) Chief, Mr. Charles K.S. Miller (303) 497-3131

Electromagnetic Technology Division (724) Chief, Dr. Robert A. Kamper (303) 497-3535

Semiconductor Electronics Division (727) Chief, Mr. Frank F. Oettinger (301) 975-2054

INFORMATION:

For additional Information on the Center for Electronics and Electrical Engineering, write or call:

Center for Electronics and Electrical Engineering

National Bureau of Standards

Metrology Building, Room B-358

Gaithersburg, MD 20899

Telephone (301) 975-2220