January 2010

NASA/TM-2010-216183

Ares I-X Flight Test Vehicle: 

Stack 5 Modal Test 

Ralph D. Buehrle, Justin D. Templeton, Mercedes C. Reaves, Lucas G. Horta, and James L. Gaspar 

Langley Research Center, Hampton, Virginia 

Paul A. Bartolotta 

Glenn Research Center, Cleveland, Ohio 

Russel A. Parks and Daniel R. Lazor 

Marshall Space Flight Center, Huntsville, Alabama 
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January 2010 

NASA/TM-2010-216183

Ares I-X Flight Test Vehicle: 

Stack 5 Modal Test 

Ralph D. Buehrle, Justin D. Templeton, Mercedes C. Reaves, Lucas G. Horta, and James L. Gaspar 

Langley Research Center, Hampton, Virginia 

Paul A. Bartolotta 

Glenn Research Center, Cleveland, Ohio 

Russel A. Parks and Daniel R. Lazor 

Marshall Space Flight Center, Huntsville, Alabama 
Available from:

NASA Center for AeroSpace Information

7115 Standard Drive

Hanover, MD 21076-1320

443-757-5802

Acknowledgments

Thanks go to Winifred Feldhaus of NASA Langley Research Center for her assistance with finite 

element model development. The test execution phase at Kennedy Space Center (KSC) could 

not have been done without the support of many individuals. Special thanks go to the KSC 

instrumentation team led by Frank Walker. Logistics and test hardware integration went 

smoothly due to the dedicated KSC crew that included Russ Brucker, Trip Healey, Stephanie 

Heffernan, Teresa Kinney, Todd Reeves, Kara Schmitt, Mark Tillett, and Jim Wiltse. Lastly, 

thanks to our independent verification team of Jeff Lollock, Ryan Tuttle, and Joshua Hwung 

from Aerospace Corporation. 
Table of Contents

1.0 Introduction 6

2.0 Pre-Test Planning 8

2.1 Test Requirements 8

2.3 Pre-Test Analysis 9

3.0 Test Description 12

3.1 Test Article 12

3.2 Test Instrumentation 14

3.3 Excitation Systems 17

3.4 Data Acquisition System 21

4.0 Stack 5 Test Operation and Data Analysis 22

4.1 Summary of Tests 22

4.2 Impact Data Analysis 23

4.3 Burst Random Data Analysis 24

4.4 Sine Sweep Data Analysis 30

5.0 Experimental Modal Analysis Results 35

6.0 Comparison of Analysis and Test 37

7.0 Summary 39

References: 39

Appendix A: Acronyms and Abbreviations 40

Appendix B: Equipment List 42

Appendix C: Instrumentation Setup and Channel Mapping 45

Appendix D: Data Acquisition Log 53

Appendix E: Test Mode Shapes 55

5
6

Abstract

Ares I-X was the first flight test vehicle used in the development 

of NASA’s Ares I crew launch vehicle. The Ares I-X used a 4-

segment reusable solid rocket booster from the Space Shuttle 

heritage with mass simulators for the 5th segment, upper stage, 

crew module and launch abort system. Three modal tests were 

defined to verify the dynamic finite element model of the Ares I-X 

flight test vehicle. Test configurations included two partial stacks 

and the full Ares I-X flight test vehicle on the Mobile Launcher 

Platform. This report focuses on the first modal test that was 

performed on the top section of the vehicle referred to as Stack 5, 

which consisted of the spacecraft adapter, service module, crew 

module and launch abort system simulators. This report describes 

the test requirements, constraints, pre-test analysis, test operations 

and data analysis for the Ares I-X Stack 5 modal test. 

1.0 Introduction

The 327 foot 1.8 million-pound Ares I-X launch vehicle [1] is shown in Figure 1. Ares I-X 

consists of a 4-segment reusable solid rocket motor from the Space Shuttle heritage with mass 

simulators for the 5th segment, upper stage, crew module (CM) and launch abort system (LAS). 

Ares I-X was successfully launched on October 28, 2009. This was the first flight test for 

NASA’s Ares I crew launch vehicle. Flight test data will provide important information on 

ascent loads, vehicle control, separation, and first stage reentry dynamics. 

As part of hardware verification for Ares I-X, a series of modal tests were designed to verify the 

dynamic finite element model (FEM) used in loads assessments and flight control evaluations. 

The first three free-free bending mode pairs were defined as the target modes for the modal test 

based on the flight control requirements. Since a test of the free-free vehicle configuration was 

not practical within the projects constraints, calibration of the FEM was done using modal test 

data for three configurations in the nominal KSC integration flow. The first of these modal tests 

was performed in May 2009 on the Stack 5 subassembly, which included the topmost hardware 

from the Spacecraft Adapter Simulator to the Launch Abort System Simulator as shown in 

Figure 2. The second test was performed in July 2009 on the Stack 1 hardware, which included 

the center section from the 5th Segment Simulator through the Interstage. Finally, the fully 

integrated Ares I-X flight test vehicle (FTV) mounted to the Mobile Launcher Platform (MLP) 

was tested in August 2009 [2]. 

This report focuses on the Stack 5 modal test. The requirements are derived from the free-free 

bending target modes. Based on these requirements, FEM pre-test analysis is used to define the 

response transducer and shaker locations. Project constraints on instrumentation numbers and 

vehicle accessibility are also discussed as part of the transducer/shaker placement studies. 

Schedule constraints required that the team conduct the tests and verify the sufficiency of the 

data in a short four-day test period. Details of the modal test planning, setup, operation, and 

results are described. Comparisons between pre-test predictions and test data are also 

summarized.
7

 

Figure 1 Ares I-X Flight Test Vehicle [1]
8

Figure 2 Ares I-X Subassembly Modal Test Configurations

 

2.0 Pre-Test Planning

2.1 Test Requirements

The Stack 5 modal test was meant to provide an early assessment of FEM adequacy for the 

subassembly. The project emphasized minimal instrumentation to characterize the bending modes and 

did not provide hard limits on test/analysis orthogonality metrics. Initially, the goal prior to conducting 

the pre-test analysis was for approximately 20 sensor locations with biaxial accelerometers for capturing 

the bending modes. To minimize impact to the program schedule and cost, test durations and 

configurations were restricted to what was available during the normal vehicle integration flow. 

Because no special provisions were made for testing, the stack 5 subassembly was tested while shimmed 

to the floor in High Bay 4 of the Vehicle Assembly Building (VAB). Testing on the floor of the VAB 

added two significant constraints to the test setup. First, shaker mounting was restricted to locations 

accessible from an external lift. Second, the boundary condition was unknown and would need to be 
9

compensated for in the analysis. Early in the planning stage the test team recognized the risk associated 

with unknown boundaries and proceeded with an effort to correct for boundary interface compliance [3], 

and planned for additional measurements across the boundaries. The boundary condition will be further 

described in the Test Description section. 

For flight control, the first three free-free bending mode pairs of the flight test vehicle were critical. 

Based on these modes, a traceability study [4] was used to define the target modes for the subassembly 

tests. For the Stack 5 configuration, the first bending mode pair was defined as the target mode set due 

to their importance for describing the 3rd bending mode pair for the integrated flight test vehicle. 

2.3 Pre-Test Analysis

The Stack 5 configuration (see Figure 3) consisted of the spacecraft adapter (SA), service module (SM), 

crew module (CM) and launch abort system (LAS) mounted on the super-segment assembly stand 

(SSAS) and heavy weight upper stage simulator (USS) transportation cart. The cart had the wheels 

removed and was shimmed level on the floor of the VAB High 

Bay 4. Although the SSAS and heavy weight cart were not part 

of the flight vehicle, models of these segments were added to the 

FEM to represent the tested configuration. A nominal boundary 

spring stiffness of 6X107lb/in was used at the shim locations to 

account for the boundary compliance in the pre-test analysis. 

FEM predictions of the first six modes are shown in Table 1 with 

the target modes highlighted. The corresponding mode shapes 

for the X-Z plane are shown in Figure 4. During pre-test 

analysis, it was observed that the system bending modes (modes 

3 and 4) were sensitive to the selected boundary stiffness but the 

LAS bending modes were relatively insensitive. 

Based on the first six bending modes, sensor and shaker 

placement was performed using the effective independence [5] 

technique along with engineering judgment. The resulting 

measurement locations included 20 biaxial and 10 triaxial sets of 

transducers as shown in Figure 5. The 45,042 degree of freedom 

(DOF) FEM was reduced to a 70 DOF test model. The 

corresponding cross-orthogonality between the reduced model 

(corresponding to the test instrumentation set) and the full model 

is used to assess the adequacy of the test instrumentation set as 

shown in Figure 6. Diagonal terms for the cross-orthogonality 

matrix are ≥0.95 and the off-diagonal terms are generally <0.1. 

However, the off-diagonal terms for mode pair 5, 6 were 0.3. 

This was deemed acceptable for this minimal instrumentation 

set. Figure 5 also shows the two shaker locations that were 

determined to be optimal within the elevation constraints. The 

elevation constraint was due to the test hardware resting on the 

floor of the VAB without surrounding infrastructure, which 

required heavy lift equipment for shaker positioning. Figure 3 Stack 5 test configuration
10

Table 1 Pre-Test Analysis Modes for Stack 5 

Mode No. Frequency

(Hz)

Mode Description

1 4.60 LAS 1st Bending Mode (X-Z Plane)

2 4.67 LAS 1

st Bending Mode (X-Y Plane)

3 12.2 System Bending (X-Z Plane)

4 14.7 System Bending (X-Y Plane)

5 26.1 LAS 2nd

 Bending Mode (X-Z Plane)

6 26.2 LAS 2nd Bending Mode (X-Y Plane)

Figure 4 FEM Pre-Test Analysis Mode Shapes for Stack 5

4.60 Hz, 4.67 Hz

Mode 1 X-Z

Mode 2 X-Y

12.2 Hz, 14.7 Hz

Mode 3 X-Z

Mode 4 X-Y

26.1 Hz, 26.2 Hz

Mode 5 X-Z

Mode 6 X-Y
11

 

 Figure 5 Stack 5 sensor/shaker locations

X

Y

Z

1

2

3

4

5

6

7

8

9

13

14

15

16

17

18

19

21

22

Shaker Y

Shaker Z 10

11,12

20

26

25

30
12

 

Figure 6 Stack 5 cross-orthogonality 

3.0 Test Description

3.1 Test Article

Testing of the Stack 5 configuration was performed in High Bay 4 of the VAB as shown in 

Figure 7. The Stack 5 hardware was mounted on the SSAS and heavy weight transportation cart, 

which was shimmed to the VAB floor at twelve locations (See Figures 8 and 9). A gap check 

was performed by sliding a piece of paper along the shim. It was found that the shim locations at 

approximately 25, 110, 175, 200, and 275 degrees had only partial contact. Shim locations at 0 

and 50 degrees were not measured due to access limitations.
13

Figure 7 Stack 5 modal test setup
14

Figure 8 Shim locations around 0-degree side of Stack 5

Figure 9 Shim location and ground accelerometers at 90 orientation

3.2 Test Instrumentation

Accelerometer and shaker locations for the Stack 5 configuration are shown in Figure 5. The asinstalled locations and orientations are listed in Table 2 using the Flight Test Vehicle (FTV) 

Structural Body Coordinate System as a reference. Accelerometer installation was performed 

according to KSC Work Plan FA-GIE-0030, Ares-IX Stack 5 Modal Test-Ground 

Instrumentation Support. Representative photographs of the accelerometer installations are 
15

provided in Figures 10 and 11. In general, capacitive accelerometers (PCB Model 3701GFA3G 

and 3701M 15) were used to measure the dynamic response of the test article. In addition to the 

capacitive accelerometers, two general-purpose triaxial accelerometers were mounted on each of 

the shakers (locations 33, 34) in case there was coupling of the test article and the shaker 

telehandler supports (see section 2.3).

Table 2 As-installed Accelerometer Locations 

Location

Number

X-station

(inches)

Angle

(degrees)

Description Measurement 

Axis

1 199.0 180.0 *LAS pre-installed -Y, Z

2 313.9 0.0 LAS Y, Z

3 382.6 0.0 LAS Y, Z

4 480.5 0.0 LAS Y, Z

5 565.2 180.0 *LAS pre-installed -Y, Z

6 631.6 0.0 LAS Y, Z

7 708.7 0.0 LAS/CM Y, Z

8 816.0 0.0 *SM Y, -Z

9 880.5 0.0 *SM; Shaker 1 (-Z) Y, -Z

10 943.0 0.0 *SA Y, -Z

11 1041.0 0.0 SASS -X, Y, Z

12 1068.3 0.0 Cart side opposite 25 -X, Y, Z

13 199.8 270.0 LAS Y, Z

14 313.9 270.0 LAS Y, Z

15 382.6 270.0 LAS Y, Z

16 480.5 270.0 LAS Y, Z

17 602. 270.0 LAS Y, Z

18 631.6 270.0 LAS Y, Z

19 708.7 270.0 LAS/CM Y, Z

20 816.1 270.0 *SM -Y, Z

21 880.0 270.0 *SM; Shaker 2 (-Y) -Y, Z

22 995.0 270.0 *SA in-line with 26 -X, -Y, Z

23 995.0 90.0 *SA in-line with 27 -X, Y, Z

24 995.0 180.0 *SA in-line with 28 -X, Y, Z

25 1069.5 0.0 Ground side opposite 12 -X, Y, Z

26 1069.5 267.0 Ground in-line with 22 -X, Y, Z

27 1069.5 85.0 Ground in-line with 23 -X, Y, Z

28 1069.5 180.0 Ground in-line with 24 -X, Y, Z

29 400.2 180.0 *LAS pre-installed -Y, Z

30 995.0 0.0 * SA in-line with 25 -X, Y, -Z

31 874.0 5.0 Shaker 1 Impedance -Z

32 874.0 275.0 Shaker 2 Impedance -Y

33 - - On shaker 1 X, Y, Z

34 - - On shaker 2 X, Y, Z

*Accelerometers mounted internally
16

Figure 10 External accelerometers at 270-degree orientation
17

Figure 11 External biaxial accelerometer configuration (left) and internal triaxial 

mounting configuration (right)

3.3 Excitation Systems

Two MB Dynamics Model 250 electro-dynamic shakers were used to provide excitation to Stack 

5 as shown in Figure 12. The shakers were installed on telehandlers during testing. The 

telehandler lifting cylinder was locked out (see Figure 13) and the wheels were chocked during 

testing. Figure 14 shows shaker 2 being aligned for installation at the 275 orientation. The 

shakers were attached to the test article through a 1⁄4-28 threaded rod stinger designed to impart 

axial loads while minimizing any lateral excitation. The stinger was attached to the test article 

through an impedance sensor and adapter plate. These adapter plates were attached to the test 

article with dental cement. The adapter plates had threaded holes in them to which the 

impedance head was attached. The adapter plates were centered 12‖ above the SA/SM interface. 

The shakers were operated simultaneously for Multiple Input Multiple Output (MIMO) burst 

random testing. Several sine sweeps using a single shaker were also performed. The idle shaker 

was disconnected from the test article during the sine sweeps. In addition to the shaker test, 

impact tests were performed for four excitation positions with all response data recorded 

simultaneously. A PCB Piezotronics Model 086B20 hammer was used for impact testing as 

shown in Figure 15.
18

Figure 12 Shakers setup on telehandlers
19

Figure 13 Installation of lockout hardware for telehandler lift
20

Figure 1 Shaker 2 being aligned for attachment to test article

Figure 15 Impact hammer excitation at location 21
21

3.4 Data Acquisition System

The 96-channel data acquisition system (DAS) consisted of six 16 channel 24-bit VXI data 

acquisition cards in a single 13-slot VXI mainframe chassis. Sufficient channels were available 

to simultaneously sample and record all data. A 16-bit VXI source card in the same chassis 

provided separate source signals for the excitation system. A Firewire interface card allowed the 

DAS to be controlled by a data acquisition computer running m+p International’s Smart Office 

Analyzer software. During the test, the software calculated the FRFs from the acceleration and 

force measurements. For all shaker tests, time and FRF data was stored directly to the 

computer’s hard drive as it was acquired. For impact testing, only the FRF’s were stored. After 

each test, the FRFs were exported to a universal file format and supplied to the test team for onsite modal parameter estimation. For a complete list of the equipment, see Appendix B.

A picture of the signal conditioner rack and data acquisition rack as they were configured for the 

modal test is shown in Figure 16. The signal conditioner rack is located on the left side of the 

figure, and the data acquisition rack is located on the right. The signal conditioner rack 

contained four filters (top of rack, two per box). The top two filters were used to filter the source 

signals before they reached the excitation system. The signal conditioner rack also contained 

five of the six signal conditioners used during the test. All of these signal conditioners, plus the 

filters and the VXI chassis were powered by an Uninterruptible Power Supply (UPS) in the 

bottom of the signal conditioner rack. The other signal conditioner was located inside the test 

article to facilitate cable routing and was powered by an extension cord from another power 

source. A separate UPS located in the bottom of the data acquisition rack was used to power the 

computer. This isolated the typically noisy computer power supply from the rest of the DAS 

equipment.

The majority of the signal conditioner channels were routed directly to the data acquisition cards 

in the VXI chassis using custom-built cables (dark gray cables). The rest of the channels were 

connected by BNC cables to patch panels at the top of the data acquisition rack. These patch 

panels were then connected to the data acquisition cards at the bottom of the rack. For more 

information on the connections from the instrumentation to the data acquisition system, see the 

channel mapping in Appendix C.
22

Figure 16. Data acquisition system configuration

4.0 Stack 5 Test Operation and Data Analysis

4.1 Summary of Tests

The modal test was performed by applying a measured excitation force to the test article and 

measuring the acceleration response at selected locations. The FRFs were calculated as the ratio 

of the acceleration response to the input force. Modal parameters (natural frequencies, damping 

factors, and mode shapes) were then estimated from the FRFs. Both the measured FRF data and 

modal parameter estimates were compared with the pre-test predictions to ensure that sufficient 

data was acquired to capture the target modes of interest. The primary datasets for modal 

parameter estimation were FRFs for multi-input random excitation at several force levels. Sine 

sweeps using a single shaker were used to check for linearity of selected modes with respect to 

force level. In addition, impact testing on the LAS was used to provide additional data for model 

verification.

The test data that was acquired during the Stack 5 modal test is listed in table 3. Ambient noise 

and impact datasets were acquired during pre-test activities on May 26th and 27th, 2009, listed as 

tests SS5-1 through SS5-4. All other datasets were acquired on May 29th, 2009. Testing on the 

VXI 

Chassis

UPS

Computer

Patch

Panel

Signal 

Conditioners

Filters
23

May 29th began with a series of burst random tests that varied burst percentage, number of 

averages, and force level. Following the burst random tests, one ambient noise measurement 

was made. Finally, force-controlled sine sweeps were performed at different force levels and 

sweep rates to investigate nonlinearities for modes 2 through 4. Sweeps were not performed on 

mode 1 due to limited test time.

Table 3 Super Stack 5 Modal Test Datasets

Test Run Type Level Direction(s) Range

SS5-1 n/a Ambient Noise n/a n/a 0 to 50 Hz

16Y4Z9ZSS5-4 n/a Impact 100 lb-pk 21Y- 0 to 50 Hz

SS5-2 n/a Ambient Noise n/a n/a 0 to 50 Hz

SS5-5 n/a Burst Random (75%, 20 avg) 8 lb-rms 9Z-, 21Y- 1 to 50 Hz

SS5-6 n/a Burst Random (50%, 20 avg) 20 lb-rms 9Z-, 21Y- 1 to 50 Hz

SS5-7 n/a Burst Random (50%, 40 avg) 20 lb-rms 9Z-, 21Y- 1 to 50 Hz

SS5-8 n/a Burst Random (50%, 20 avg) 50 lb-rms 9Z-, 21Y- 1 to 50 Hz

SS5-9 n/a Burst Random (50%, 20 avg) 90 lb-rms 9Z-, 21Y- 1 to 50 Hz

SS5-10 n/a Ambient Noise n/a n/a 0 to 50 Hz

1 Sine Sweep (1.0 Hz/min) 10 lb-pk

2 Sine Sweep (0.5 Hz/min) 20 lb-pk

3 Sine Sweep (0.25 Hz/min) 20 lb-pk

4 Sine Sweep (0.1 Hz/min) 20 lb-pk

5 Sine Sweep (0.1 Hz/min) 50 lb-pk

6 Sine Sweep (0.1 Hz/min) 100 lb-pk

1 Sine Sweep (0.2 Hz/min) 20 lb-pk

2 Sine Sweep (0.2 Hz/min) 100 lb-pk

1 Sine Sweep (0.2 Hz/min) 20 lb-pk

2 Sine Sweep (0.2 Hz/min) 100 lb-pk

SS5-13 9Z8.34 to 

9.31 Hz

SS5-3 n/a Impact 100 lb-pk 0 to 50 Hz

SS5-12 21Y9.22 to 

10.32 Hz

SS5-11 21Y3.75 to

4.84 Hz

4.05 to 

4.54 Hz

4.2 Impact Data Analysis

Prior to connecting the shakers, impact tests were performed to get an initial assessment of the 

modal properties. Sampling parameters were a 1024 Hz sample rate, 8-second block size, and 5 

averages. Figures 17 and 18 show results for impacts on the LAS. The target bending modes 

were identified but the frequencies for the system bending modes (modes 3 and 4 from Table 1) 

were well below the pre-test predictions. These differences were attributed to the unknown 

boundary stiffness.
24

4.3 Burst Random Data Analysis

The burst random excitation data sets were the primary data for mode shape estimation and 

model calibration. In this section, the data quality from these tests is evaluated based on the FRF, 

coherence, reciprocity, and input force characteristics. Measurement linearity with force 

amplitude is also examined for the three random input test levels. A comparison of the burst 

random and impact data is also used to verify data consistency.

Selection of the resolution for the burst random datasets was a function of both the desired data 

quality and the limited test time available [6]. The data was sampled at 128 Hz with a block size 

of 32 seconds to achieve the desired resolution of 0.03125 Hz. Several data sets were acquired 

to examine the burst percentage and number of averages. Based on this data, a 50% burst with 

20 averages was used to acquire burst random data at three force levels.

Sample FRF and coherence data from the 90 lb-rms burst random test is shown in figures 19 and 

20 below. The blue curves show the drive point FRFs, and the green curves show the FRFs for 

the topmost locations. The red and teal curves show the multiple coherence between these 

response locations and both input forces. The measurements shown had good coherence values 

(> 0.8) in the vicinity of all target modes. From the figures, it is apparent that the first two 

modes in the Z-direction and first mode in the Y-direction were well defined, whereas the modes 

above 20.0 Hz were closely spaced but distinguishable. The second mode in the Y-direction 

does not have a clean peak, but is instead flattened at the top. This flattening at the peak is 

possibly due to nonlinearities in the boundary associated with the gaps observed for some of the 

shims at the cart to floor interface, and/or noise that was present in every test at harmonics of 

10.0 Hz. The 10 Hz noise that was present during testing is illustrated in figure 21, which shows 

the autopower measurement of a ground accelerometer during the ambient noise test, SS5-10. 
25

Figure 19 Z-direction FRFs from 90 lb-rms burst random test

Figure 20 Y-direction FRFs from 90 lb-rms burst random test

Frequency - Hz

Log g/lbf

Amplitude /

Phase degPhase deg

0 10 20 30 40 50

100n

10m

1m

100μ

10μ

1μ

0

1

800m

600m

400m

200m

0 10 20 30 40 50

-200

200

100

50

0

-50

-100

-200

200

100

50

0

-50

-100

FRF(SS5.9.Z-,SS5.9.Z-)[90lb-rms] 

FRF(SS5.1.Z,SS5.9.Z-)[90lb-rms] 

Multiple coherence(SS5.9.Z-,SS5.9.Z-) 

Multiple coherence(SS5.1.Z,SS5.1.Z) 

Frequency - Hz

Log g/lbf

Amplitude /

Phase degPhase deg

0 10 20 30 40 50

100n

10m

1m

100μ

10μ

1μ

0

1

800m

600m

400m

200m

0 10 20 30 40 50

-200

200

100

50

0

-50

-100

-200

200

100

50

0

-50

-100

FRF(SS5.21.Y-,SS5.21.Y-)[90lb-rms] 

FRF(SS5.13.Y,SS5.21.Y-)[90lb-rms] 

Multiple coherence(SS5.21.Y-,SS5.21.Y-) 

Multiple coherence(SS5.13.Y,SS5.13.Y) 
26

Figure 21 Autopower of ground accelerometer during ambient noise test SS5-10

The result of a reciprocity check from the 90 lb-rms burst random test is shown in figure 22, 

which compares the impedance head accelerometer FRFs. Channel 32Y is the impedance head 

accelerometer for the shaker at 21Y- and channel 31Z is the impedance head accelerometer for 

the shaker at 9Z-. As shown, the structure exhibited good reciprocity for the Multi-Input MultiOutput (MIMO) burst random test. 

Frequency - Hz

Log g2 pk

0 10 20 30 40 50

100f

1n

100p

10p

1p

Autopower(SS5.25.X-,SS5.25.X-) 
27

Figure 22 Reciprocity from 90 lb-rms burst random test with impedance head 

accelerometers

Prior to testing, there was concern that the telehandlers supporting the shakers may adversely 

affect the shaker input characteristics. Figure 23 shows the force spectra measured during the 90 

lb-rms burst random test. The force input spectrum shows good input across the bandwidth as 

indicated by the relatively flat response with no significant dips.

Another check on the input forces was done using principal component analysis. Results are 

shown for the 90 lb-rms burst random test in figure 24. The separation between the principal 

components was no greater than 5 dB, indicating that there was little to no correlation between 

the input force signals in the bandwidth of interest. This conclusion can also be reached by 

observing the coherence between the input forces, which was much less than 1 across the 

frequency band.

 

Frequency - Hz

Log g/lbf Phase deg

0 10 20 30 40 50

100n

10m

1m

100μ

10μ

1μ

0 10 20 30 40 50

-200

200

100

50

0

-50

-100

FRF(SS5.32.Y,SS5.9.Z-) 

FRF(SS5.31.Z,SS5.21.Y-) 
28

Figure 23 Input autopower from 90 lb-rms burst random test

Figure 24 Principal input spectra and coherence from 90 lb-rms burst random test

Frequency - Hz

Log lbf2 pk

0 10 20 30 40 50

10m

100

10

1

100m

Autopower(SS5.9.Z-,SS5.9.Z-) 

Autopower(SS5.21.Y-,SS5.21.Y-) 

Frequency - Hz

dB Ref 50.5f lbf2/Hz

Amplitude /

0 10 20 30 40 50

260

320

300

280

0

1

800m

600m

400m

200m

Principal component(Principal Force Spectrum 1 ,2 

Principal component(Principal Force Spectrum 2 ,2 

Coherence(SS5.9.Z-,SS5.21.Y-) 
29

Figures 25 and 26 show a comparison of the burst random FRFs for three force levels. As 

shown, the Stack 5 subassembly responded linearly, with peak frequency changes less than or 

equal to 1.06% between the 20 and 90 lb-rms burst random tests. Because the nature of random

excitation is to linearize test results, sine sweep tests were also performed to investigate possible 

nonlinearities in the structure.

Figure 25 Z-direction FRFs from burst random tests SS5-6, SS5-8, and SS5-9

Frequency - Hz

Log g/lbf Phase deg

0 10 20 30 40 50

100n

10m

1m

100μ

10μ

1μ

0 10 20 30 40 50

-200

200

100

50

0

-50

-100

FRF(SS5.1.Z,SS5.9.Z-)[20lb-rms] 

FRF(SS5.1.Z,SS5.9.Z-)[50lb-rms] 

FRF(SS5.1.Z,SS5.9.Z-)[90lb-rms] 
30

Figure 26 Y-direction FRFs from burst random tests SS5-6, SS5-8, and SS5-9

Table 4 Peak Frequency Variation for Random Excitation

Mode

Random 20 lb-rms

Peak Frequency (Hz)

Random 90 lb-rms

Peak Frequency (Hz)

Percent

Difference (%)

1 4.19 4.19 0.00

2 4.34 4.31 0.73

3 8.94 8.84 1.06

4 10.03 9.94 0.94

4.4 Sine Sweep Data Analysis

Sine sweep tests were performed to evaluate the linearity of the response with respect to 

excitation level. One important parameter for obtaining useful results from a sine sweep is the 

sweep rate. Time histories of LAS tip acceleration for various sweep rates are shown in figure 

27. Only portions of the 0.25 Hz/min and 0.5 Hz/min sweeps are shown in figure 27 so that they 

are properly scaled with respect to the 0.1 Hz/min sweep. As the sweep rate decreases, the 

structure is given more time to respond to the inputs, so the peak frequency comes closer to the 

actual steady state peak frequency of the desired mode. For the sweep through the 2nd mode 

frequency, a sweep rate of 0.1 Hz/min was selected. However, Ewins [7] recommends a sweep 

rate less than 216(fn)

2

(ζn)

2

, which is 0.036 Hz/min for this particular mode. Sweeping up and 

Frequency - Hz

Log g/lbf Phase deg

0 10 20 30 40 50

100n

10m

1m

100μ

10μ

1μ

0 10 20 30 40 50

-200

200

100

50

0

-50

-100

FRF(SS5.13.Y,SS5.21.Y-)[20lb-rms] 

FRF(SS5.13.Y,SS5.21.Y-)[50lb-rms] 

FRF(SS5.13.Y,SS5.21.Y-)[90lb-rms] 
31

down over the range of ±5% of the natural frequency would have required 28 minutes to 

complete, and multiple levels were required to investigate nonlinearity. Because of the short test 

schedule, the sweep rate of 0.1 Hz/min was chosen for this mode, requiring only 10 minutes for a 

sweep up and down. The resulting error in the peak frequency for mode 2 is less than 1% [8]

with this sweep rate. Sweep rates for modes 3 and 4 were 0.2 Hz/min, which was slower than 

the recommended maximum rates defined by Ewins (≤216 (fn)

2

(ζn)

2 ) [7]. A representative time 

history from the 20 lb sine sweep for mode 4 is shown in Figure 28.

Figure 27 LAS tip acceleration for 20 lb-pk sine sweep on mode 2 at various sweep rates

Figure 28 LAS tip acceleration for 20 lb-pk sine sweep on mode 4
32

To estimate FRFs from the sine sweeps, the time histories were split between sweeps up and 

down, and a single Discrete Fourier Transform (DFT) was taken of each. Because a single DFT 

block was used to process the data, the FRFs were estimated by a simple ratio of the acceleration 

spectra divided by the force spectrum. Figure 29 shows the FRF results from the 0.1 Hz/min 

upward sweeps for the 2nd mode at 20, 50, and 100 lb-pk, compared to the 90 lb-rms burst 

random FRF. As the force level increased, the frequency decreased, as indicated by the peaks 

moving to the left with increased force level. A comparison of the FRFs resulting from different 

sweep directions is shown in figure 30. It is interesting to note that although the FRF from the 

sweep down had a higher peak value, the peak frequency remained nearly identical.

Figure 29 Variation in mode 2 response due to varying sine sweep levels

Frequency - Hz

Log g/lbf Phase deg

4.09994 4.2 4.3 4.4 4.5

100μ

10m

1m

4.09994 4.2 4.3 4.4 4.5

-200

200

10050

0

-50

FRF(SS5.13.Y,SS5.21.Y-)[90lb-rms] 

FRF(SS5.13.Y,SS5.21.Y-)[20lb-pk,Up] 

FRF(SS5.13.Y,SS5.21.Y-)[50lb-pk,Up] 

FRF(SS5.13.Y,SS5.21.Y-)[100lb-pk,Up] 
33

Figure 30 Variation in mode 2 response due to sweep direction

A similar approach was used to investigate modes 3 and 4. For these modes, the sweep rate was 

selected to be 0.2 Hz/min. Figures 31 and 32 show that these modes both decreased in frequency 

as the force level increased. For mode 4, all FRFs indicated two peaks of slightly different 

magnitude in the same frequency range. This was also seen in the burst random data and may be 

due to nonlinearities in the boundary associated with the gaps observed for some of the shims at 

the cart to floor interface. 

Frequency - Hz

Log g/lbf Phase deg

4.09994 4.2 4.3 4.4 4.5

100μ

10m

1m

4.09994 4.2 4.3 4.4 4.5

-200

200

10050

0

-50

FRF(SS5.13.Y,SS5.21.Y-)[90lb-rms] 

FRF(SS5.13.Y,SS5.21.Y-)[100lb-pk,Up] 

FRF(SS5.13.Y,SS5.21.Y-)[100lb-pk,Down] 
34

Figure 31 Variation in mode 3 response due to varying sine sweep levels

Figure 32 Variation in mode 4 response due to varying sine sweep levels

Frequency - Hz

Log g/lbf Phase deg

8.3 8.5 9 9.30001

100μ

10m

1m

8.3 8.5 9 9.30001

-200

200

10050

0

-50

FRF(SS5.1.Z,SS5.9.Z-)[90lb-rms] 

FRF(SS5.1.Z,SS5.9.Z-)[20lb-pk,Up] 

FRF(SS5.1.Z,SS5.9.Z-)[100lb-pk,Up] 

FRF(SS5.1.Z,SS5.9.Z-)[100lb-pk,Down] 

Frequency - Hz

Log g/lbf Phase deg

9.3 9.5 10 10.3001

100μ

1m

9.3 9.5 10 10.3001

-200

200

10050

0

-50

FRF(SS5.13.Y,SS5.21.Y-)[90lb-rms] 

FRF(SS5.13.Y,SS5.21.Y-)[20lb-pk,Up] 

FRF(SS5.13.Y,SS5.21.Y-)[100lb-pk,Up] 

FRF(SS5.13.Y,SS5.21.Y-)[100lb-pk,Down] 
35

A summary of the sine sweep test results is given in table 5, which shows the peak frequencies at 

20 lb-pk and 100 lb-pk force levels. The table shows that these modes did not vary more than 

1.92% over the tested force range. Mode 1 is not included in the table because there was 

insufficient test time to complete another series of sine sweeps for that particular mode. The 

random tests indicated that mode 1 was the most linear of the modes, so further investigation was 

not necessary. As was described in the pre-test analysis, modes 3 and 4 (system bending) were 

most influenced by the boundary condition. These modes show more variation than the 2nd

mode, which may be due to nonlinearities in the boundary interface. In any case, the variations 

observed are small and the system behaved fairly linearly over the tested force levels.

Table 5 Peak Frequency Variation Due to Sine Sweep Excitation Level

Mode

Sweep Up

20 lb-pk Peak

Frequency (Hz)

Sweep Up

50 lb-pk Peak

Frequency (Hz)

Sweep Up

100 lb-pk Peak

Frequency (Hz)

20 vs. 100 lb-pk

Percent

Difference (%)

2 4.3265 4.3163 4.3027 -0.55

3 8.7799 n/a 8.6116 -1.92

4 9.9453 n/a 9.8150 -1.31

5.0 Experimental Modal Analysis Results

To verify that the telehandler did not affect the modal frequencies of the test article, the results of 

impact and burst random tests were compared. Figures 33 and 34 show sample FRFs from both 

test methods. The peak frequencies of the target modes are consistent for both tests methods, 

verifying that the shaker setup did not have a significant effect on the data. Differences in FRF 

characteristics near the peaks are attributed to the different excitation methods and data 

acquisition parameters. In comparison to the impact data, the burst random data provided higher 

averages, higher frequency resolution, higher signal to noise, and better control of the frequency 

range and level of excitation. Therefore, the burst random data is recommended for parameter 

estimation efforts. 

Results of parameter estimation for the burst random data at 90 lbrms (Test: SS5-9) are shown in 

Table 6. The corresponding mode shapes are shown in Appendix E. Each of the targeted mode 

pairs from the pre-test analysis (Table 1, Figure 4) is identified. However, the measured 

preferred directions of motion varied from those predicted. This is attributed to the symmetry of 

the structure. Although the measured bending modes are not on the Y- and Z-axis, as predicted, 

they still provide an orthogonal set that adequately describes the modal space. A test geometry 

file and final set of modes is included on the data archival DVD. 
36

Figure 33 Z-direction FRFs from impact test and 90 lb-rms burst random test

Figure 34 Y-direction FRFs from impact test and 90 lb-rms burst random test

Frequency - Hz

Log g/lbf Phase deg

0 10 20 30 40 50

100n

10m

1m

100μ

10μ

1μ

0 10 20 30 40 50

-200

200

100

50

0

-50

-100

FRF(SS5.1.Z,SS5.9.Z-)[90lb-rms] 

FRF(SS5.1.Z,SS5.9.Z-)[Impact] 

Frequency - Hz

Log g/lbf Phase deg

0 10 20 30 40 50

100n

10m

1m

100μ

10μ

1μ

0 10 20 30 40 50

-200

200

100

50

0

-50

-100

FRF(SS5.13.Y,SS5.21.Y-)[90lb-rms] 

FRF(SS5.13.Y,SS5.21.Y-)[Impact] 
37

Table 6 Experimental Modal Analysis Results; 90 lbrms Burst Random Test

Mode Frequency (Hz) Damping (%) Description

1 4.18 0.30 LAS 1st bending

2 4.32 0.33 LAS 1st bending

3 8.84 1.17 System bending

4 9.90 1.57 System bending

5 22.6 0.51 LAS 2nd bending

6 23.1 0.44 LAS 2nd bending

6.0 Comparison of Analysis and Test

A summary of the comparisons between the pre-test analysis and test data is provided. Details of 

the model calibration process can be found in Horta [9]. Initial pre-test analysis indicated 

significant discrepancies in the system bending mode frequencies as indicated in Table 7. After 

updating the boundary stiffness and correcting the LAS nozzle inertia properties based on 

measured mass properties, the first LAS bending mode pair that is critical for the flight test 

vehicle modes of interest was within 2.9%. Correlation of the 3rd through 6

th mode frequencies

was also greatly improved. As a means of comparing mode shapes, the cross-orthogonality with 

the test data is shown for the pre-test and updated model in Figures 35 and 36. When examining 

the orthogonality results recall that values range from 0 to 1 with 1 representing an exact match

as indicated by the corresponding black square. It is clear that updates to the boundary stiffness 

not only reduced the frequency error but also helped correct for errors in the principal directions, 

as indicated by the reduced off-diagonal terms. After the sixth mode the orthogonality values 

quickly drop off, indicating an inability to capture the higher frequency modes with the test 

instrumentation set.

Table 7 Analysis/Test Frequency Comparison; 90 lbrms Burst Random Test

Mode Pre-Test FEM 

Frequency 

(Hz)

Updated FEM 

Frequency 

(Hz)

Test 

Frequency 

(Hz)

% Difference

( updated FEM - test)/ test*100

1 4.60 4.30 4.18 2.9

2 4.68 4.38 4.32 1.4

3 12.19 8.73 8.84 -1.2

4 14.72 9.24 9.90 -6.7

5 26.06 25.04 23.1 8.4

6 26.25 25.12 22.6 11.2
38

Figure 35 SS5 orthogonality results with pre-test model 

 

 Figure 36 SS5 orthogonality results with optimized boundary parameters 

1 2 3 4 5 6 7 8 9 10 11 12 13 14

 4.60

 4.68

12.19

14.72

26.06

26.25

35.20

36.60

38.44

38.45

40.61

41.28

41.86

41.90

42.65

44.74

46.39

47.88

48.08

52.02

Test Mode No. 

Analysis Freq. (Hz)

MASS Ortho 

 

Frequency (Hz) 4.18 4.32 8.84 9.90 22.64 23.13 23.30 23.58 24.06 24.77 26.14 26.59 26.71 27.17

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

0.9

1 2 3 4 5 6 7 8 9 10 11 12 13 14

 4.30

 4.38

 8.73

 9.24

25.04

25.12

26.44

30.66

33.34

34.91

36.78

37.99

38.28

38.37

39.72

41.29

41.65

43.90

44.49

45.49

Test Mode No. 

Analysis Freq. (Hz)

MASS Ortho 

 

Frequency (Hz) 4.18 4.32 8.84 9.90 22.64 23.13 23.30 23.58 24.06 24.77 26.14 26.59 26.71 27.17

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

0.9
39

7.0 Summary

The modal test successfully identified all of the targeted bending modes. Modal parameters were 

obtained using both multi-input burst random and impact excitations. Additionally, sine sweep 

tests were performed on the 2

nd through 4th modes to investigate frequency nonlinearities. 

Results from multiple levels of random and sine sweep testing indicated a fairly linear response 

behavior, with maximum frequency shifts of 1.9% for over quadruple the force levels. 

The FEM required updating of the boundary stiffness due to the unconventional test boundary 

with the systems resting on shims. An error in the inertias of the LAS nozzles was also 

identified and updated in the FEM. Further details on the model calibration can be found in 

Horta [9].

References:

[1] NASA Fact Sheet, Constellation Program: Ares I-X Flight Test Vehicle, FS-2009-03-007-

JSC, 2009. http://www.nasa.gov/pdf/354470main_aresIX_fs_may09.pdf

[2] Buehrle, R. D., Templeton, J. D., Reaves, M. C., Horta, L. H., Bartolotta, P. A., Parks, R. A., 

Lazor, D. R., and Gaspar, J. L; Ares I-X Flight Test Vehicle Modal Test, NASA/TM-20xxxxxxxx, Submitted December 2009

[3] Tuttle, R., and Lollock, J. A.; Modal Test Data Adjustment for Interface Compliance, 

Proceedings of IMAC XXVIII, Jacksonville, Florida, February 1-4, 2010.

[4] Tuttle, R., Lollock, J.A, and Hwung, J.S.: ―Identifying Goals for Ares I-X Modal Testing,‖ 

Proceedings of IMAC XXVIII, Jacksonville, FL., February 1-4, 2010.

[5] Kammer, D. C.; Sensor Placement for On-Orbit Modal Identification and Correlation of 

Large Space Structures, Journal of Guidance, Volume 14, No. 2, March-April 1991.

[6] Templeton, J. D., Buehrle, R. D., Parks, R. A., Lazor, D. R., and Gaspar, J. L.; Ares I-X 

Launch Vehicle Modal Test Measurements and Data Quality Assessments, Proceedings of 

IMAC XXVIII, Jacksonville, Florida, February 1-4, 2010.

[7] Ewins, D.J., Modal Testing: Theory, Practice and Application, 2nd Edition, Research Studies 

Press Ltd., pp. 231-234, 2000.

[8] Lollock, J. A., ―The Effect of Swept Sinusoidal Excitation on the Response of a SingleDegree-of-Freedom Oscillator,‖ 43rd AIAA/ASME/ASCE/AHS/ASC Structures, Structural 

Dynamics and Materials Conference, April 2002.

[9] Horta, L. H., Reaves, M. C., Buehrle, R. D., Templeton, J. D., Lazor, D. R., Gaspar, J. L., 

Parks, R. A., and Bartolotta, P. A..; Finite Element Model Calibration Approach for Ares I-X, 

Proceedings of IMAC XXVIII, Jacksonville, Florida, February 1-4, 2010.
40

Appendix A: Acronyms and Abbreviations 

BNC (Bayonet Neill Concelman) coaxial cable connector

CM Crew Module

CS Coordinate System

CDAS Critical Data Acquisition System

DAS Data Acquisition System

DFT Discrete Fourier Transform

DOF Degree of Freedom

FEM Finite Element Model

FTINU Fault Tolerant Inertial Navigation Unit

FRF Frequency Response Function

FTV Flight Test Vehicle 

GRC Glenn Research Center

GSE Ground Support Equipment

HPS Hydraulic Power Supply

Hz Hertz

IEEE Institute of Electrical and Electronics Engineers

IEPE Integrated Electronics Piezo Electric

IPT’s Integrated Product Teams

IS Interstage

IVM Integrated Vehicle Model

HB High Bay 

KSC Kennedy Space Center

LaRC Langley Research Center

LAS Launch Abort System

lb Pound

LVDT Linear Variable Displacement Transducer

MIMO Multi-Input Multi-Output
41

MLP Mobile Launcher Platform

MSFC Marshall Space Flight Center

pk Peak

psi Pounds per square inch 

PV Principal Value

rms Root Mean Square

RRGU Redundant Rate Gyro Unit

SA Spacecraft Adapter

SE&I Systems Engineering & Integration

SM Service Module

SSAS Super-Segment Assembly Stand

STDev Standard Deviation

STI Scientific and Technical Information 

TBD To Be Determined

TBR To Be Resolved

UPS Uninterrupted Power Supply 

USS Upper Stage Simulator

VAB Vehicle Assembly Building

VXI VME eXtensions for Instrumentation
42

Appendix B: Equipment List

Table B.1. Stack 5 Equipment List (1 of 3)

DATA ACQUISITION SYSTEM (DAS) RACK

NAME MANUFACTURER MODEL SERIAL OWNER QTY CAL DATE CAL DUE MISC

VXI MAINFRAME AGILENT TECHNOLOGIES E8403A US38001676 LaRC 1 n/a n/a

SLOT-0 INTERFACE AGILENT TECHNOLOGIES E8491A US39007039 LaRC 1 n/a n/a VXI 0

16 CHANNEL DIGITIZER VXI TECHNOLOGY INC VT1432B US45004211 LaRC 1 8/17/2007 8/17/2009 VXI 1

16 CHANNEL DIGITIZER VXI TECHNOLOGY INC VT1432B US45004212 LaRC 1 8/16/2007 8/16/2009 VXI 2

16 CHANNEL DIGITIZER VXI TECHNOLOGY INC VT1432B US45004209 LaRC 1 8/16/2007 8/16/2009 VXI 3

16 CHANNEL DIGITIZER VXI TECHNOLOGY INC VT1432B US45004210 LaRC 1 8/16/2007 8/16/2009 VXI 4

16 CHANNEL DIGITIZER VXI TECHNOLOGY INC VT1432B US45004537 LaRC 1 1/22/2008 1/22/2010 VXI 5

16 CHANNEL DIGITIZER VXI TECHNOLOGY INC VT1432B US45004538 LaRC 1 1/22/2008 1/22/2010 VXI 6

4 CHANNEL SOURCE MODULE HEWLETT-PACKARD CO E1434A US37260104 LaRC 1 n/a n/a VXI 7

DIGITAL OSCILLOSCOPE TEKTRONIX TDS2014 C014678 LaRC 1 n/a n/a

ICP/VOLTAGE 8CH INPUT BOX AGILENT TECHNOLOGIES 3241A n/a LaRC 4 n/a n/a

VOLTAGE 8CH INPUT BOX HEWLETT-PACKARD CO 3240A n/a LaRC 4 n/a n/a

SIGNAL CONDITIONER (S/C) RACK

NAME MANUFACTURER MODEL SERIAL OWNER QTY CAL DATE CAL DUE MISC

ICP SIGNAL CONDITIONER PCB PIEZOTRONICS 584A 1135 LaRC 1 2/9/2009 2/9/2010 S/C 1

CAPACITIVE SIGNAL CONDITIONER PCB PIEZOTRONICS 478A16 151 LaRC 1 11/7/2008 11/7/2009 S/C 2

CAPACITIVE SIGNAL CONDITIONER PCB PIEZOTRONICS 478A16 156 MSFC 1 3/10/2009 3/10/2010 S/C 3

CAPACITIVE SIGNAL CONDITIONER PCB PIEZOTRONICS 478A16 154 MSFC 1 3/10/2009 3/10/2010 S/C 4

CAPACITIVE SIGNAL CONDITIONER PCB PIEZOTRONICS 478A16 312 MSFC 1 1/12/2009 1/12/2010 S/C 5

CAPACITIVE SIGNAL CONDITIONER PCB PIEZOTRONICS 478A16 157 MSFC 1 1/12/2009 1/12/2010 S/C 6

BANDPASS FILTER KROHN-HITE 3343 2080 LaRC 1 4/20/2009 4/20/2011

ICP INSTRUMENTATION

NAME MANUFACTURER MODEL SERIAL OWNER QTY CAL DATE CAL DUE SENS

IMPACT HAMMER PCB PIEZOTRONICS 086B20 4095 LaRC 1 4/9/2009 4/9/2010 1.08 mV/lbf

TRIAXIAL ACCELEROMETER PCB PIEZOTRONICS 356B21 89390x MSFC 1 1/13/2009 1/13/2010 9.99 mV/g

| | | 89390y MSFC 1 1/13/2009 1/13/2010 9.99 mV/g

V V V 89390z MSFC 1 1/13/2009 1/13/2010 9.71 mV/g

TRIAXIAL ACCELEROMETER PCB PIEZOTRONICS 356B21 89525x MSFC 1 1/19/2009 1/19/2010 10 mV/g

| | | 89525y MSFC 1 1/19/2009 1/19/2010 10.11 mV/g

V V V 89525z MSFC 1 1/19/2009 1/19/2010 9.95 mV/g

IMPEDANCE HEAD PCB PIEZOTRONICS 288M34 1785 MSFC 1 2/10/2009 2/10/2010 9.837 mV/lbf

V V V 1785 MSFC 1 2/10/2009 2/10/2010 99.0 mV/g

IMPEDANCE HEAD PCB PIEZOTRONICS 288M34 1783 MSFC 1 2/10/2009 2/10/2010 9.915 mV/lbf

V V V 1783 MSFC 1 2/10/2009 2/10/2010 100.3 mV/g
43

Table B.1. Stack 5 Equipment List (2 of 3)

MSFC ACCELEROMETERS

NAME MANUFACTURER MODEL SERIAL OWNER QTY CAL DATE CAL DUE 159.2Hz SENS (mV/g) DC SENS (mV/g)

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2562 MSFC 1 1/21/2009 1/21/2010 998 975

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2563 MSFC 1 1/21/2009 1/21/2010 1050 988

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2567 MSFC 1 1/22/2009 1/22/2010 1020 989

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2569 MSFC 1 1/21/2009 1/21/2010 1000 991

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2570 MSFC 1 1/21/2009 1/21/2010 964 980

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2571 MSFC 1 1/21/2009 1/21/2010 975 982

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2576 MSFC 1 1/21/2009 1/21/2010 991 975

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2577 MSFC 1 1/21/2009 1/21/2010 1050 989

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2578 MSFC 1 1/22/2009 1/22/2010 983 984

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2579 MSFC 1 1/21/2009 1/21/2010 1020 984

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2580 MSFC 1 1/21/2009 1/21/2010 1040 990

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2581 MSFC 1 1/21/2009 1/21/2010 1040 988

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2582 MSFC 1 1/21/2009 1/21/2010 1040 997

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2583 MSFC 1 1/21/2009 1/21/2010 1040 986

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2584 MSFC 1 1/22/2009 1/22/2010 1030 983

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2585 MSFC 1 1/22/2009 1/22/2010 996 992

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2586 MSFC 1 1/22/2009 1/22/2010 999 981

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2587 MSFC 1 1/21/2009 1/21/2010 1030 991

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2588 MSFC 1 1/22/2009 1/22/2010 1020 978

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2589 MSFC 1 1/21/2009 1/21/2010 979 983

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2591 MSFC 1 1/22/2009 1/22/2010 1040 990

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2592 MSFC 1 1/21/2009 1/21/2010 1040 986

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2595 MSFC 1 1/22/2009 1/22/2010 1010 995

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2596 MSFC 1 1/22/2009 1/22/2010 1040 988

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2597 MSFC 1 1/21/2009 1/21/2010 1040 997

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2598 MSFC 1 1/21/2009 1/21/2010 1020 1000

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2599 MSFC 1 1/21/2009 1/21/2010 974 991

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2601 MSFC 1 1/22/2009 1/22/2010 1000 988

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2603 MSFC 1 1/21/2009 1/21/2010 1030 984

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2605 MSFC 1 1/22/2009 1/22/2010 987 984

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2606 MSFC 1 1/22/2009 1/22/2010 1020 987

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2607 MSFC 1 1/22/2009 1/22/2010 1010 983

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2608 MSFC 1 1/22/2009 1/22/2010 1010 985

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2609 MSFC 1 1/21/2009 1/21/2010 1030 981

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2610 MSFC 1 1/22/2009 1/22/2010 1000 983

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2611 MSFC 1 1/21/2009 1/21/2010 1020 994

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2612 MSFC 1 1/21/2009 1/21/2010 1040 988

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2613 MSFC 1 1/21/2009 1/21/2010 1010 995

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2614 MSFC 1 1/22/2009 1/22/2010 1040 974

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2615 MSFC 1 1/22/2009 1/22/2010 1050 992

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2670 MSFC 1 1/22/2009 1/22/2010 1050 992

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2671 MSFC 1 1/22/2009 1/22/2010 1030 984

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2672 MSFC 1 1/21/2009 1/21/2010 991 986

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2673 MSFC 1 1/22/2009 1/22/2010 1030 985

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2675 MSFC 1 1/22/2009 1/22/2010 1030 988

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2676 MSFC 1 1/21/2009 1/21/2010 943 991

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 2679 MSFC 1 1/22/2009 1/22/2010 1030 981

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8138 MSFC 1 1/21/2009 1/21/2010 1010 976

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8139 MSFC 1 1/21/2009 1/21/2010 985 977

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8140 MSFC 1 1/21/2009 1/21/2010 1060 1020

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8141 MSFC 1 1/21/2009 1/21/2010 1010 977

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8142 MSFC 1 1/21/2009 1/21/2010 1020 999

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8156 MSFC 1 1/21/2009 1/21/2010 941 990

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8157 MSFC 1 1/21/2009 1/21/2010 977 999
44

Table B.1. Stack 5 Equipment List (3 of 3)

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8158 MSFC 1 1/21/2009 1/21/2010 1010 987

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8159 MSFC 1 1/21/2009 1/21/2010 1010 997

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8160 MSFC 1 1/21/2009 1/21/2010 994 983

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8161 MSFC 1 1/21/2009 1/21/2010 932 980

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8162 MSFC 1 1/21/2009 1/21/2010 941 965

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8163 MSFC 1 1/21/2009 1/21/2010 1030 981

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8164 MSFC 1 1/21/2009 1/21/2010 972 1000

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8165 MSFC 1 1/21/2009 1/21/2010 986 980

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8166 MSFC 1 1/21/2009 1/21/2010 979 992

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8167 MSFC 1 1/21/2009 1/21/2010 1040 989

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8168 MSFC 1 1/21/2009 1/21/2010 998 984

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8169 MSFC 1 1/21/2009 1/21/2010 1040 990

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8170 MSFC 1 1/21/2009 1/21/2010 1010 981

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8171 MSFC 1 1/21/2009 1/21/2010 975 985

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8172 MSFC 1 1/22/2009 1/22/2010 981 984

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8173 MSFC 1 1/21/2009 1/21/2010 961 979

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8174 MSFC 1 1/21/2009 1/21/2010 951 972

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8175 MSFC 1 1/21/2009 1/21/2010 962 999

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8176 MSFC 1 1/21/2009 1/21/2010 929 984

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8177 MSFC 1 1/21/2009 1/21/2010 961 983

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8178 MSFC 1 1/21/2009 1/21/2010 1090 981

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8179 MSFC 1 1/21/2009 1/21/2010 978 980

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8180 MSFC 1 1/21/2009 1/21/2010 992 994

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8181 MSFC 1 1/21/2009 1/21/2010 1040 988

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701M15 8182 MSFC 1 1/21/2009 1/21/2010 1000 996

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3711D1FA3G 517 MSFC 1 1/22/2009 1/22/2010 658 702

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3711D1FA3G 518 MSFC 1 1/22/2009 1/22/2010 661 694

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3711D1FA3G 519 MSFC 1 1/22/2009 1/22/2010 659 696

LAS PRE-INSTALLED ACCELEROMETERS

NAME MANUFACTURER MODEL SERIAL OWNER QTY CAL DATE CAL DUE 30Hz SENS (mV/g) DC SENS (mV/g)

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701G3FA3G 2020 LaRC 1 10/1/2008 10/1/2009 991.25 996.6

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701G3FA3G 2021 LaRC 1 9/29/2008 9/29/2009 998.74 1009.3

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701G3FA3G 2022 LaRC 1 10/1/2008 10/1/2009 998.93 995.9

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701G3FA3G 2023 LaRC 1 10/1/2008 10/1/2009 996.69 991.0

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701G3FA3G 2026 LaRC 1 9/29/2008 9/29/2009 993.12 991.0

CAPACITIVE ACCELEROMETER PCB PIEZOTRONICS 3701G3FA3G 2027 LaRC 1 9/29/2008 9/29/2009 997.99 1003.9
45

Appendix C: Instrumentation Setup and Channel Mapping

Table C.1. Instrumentation Locations and Notes

Location X Station Angle Notes

1 199 180 Pre-Installed in LAS

2 313.9 0

3 382.6 0

4 480.5 0

5 565.2 180 Pre-Installed in LAS

6 631.6 0

7 708.7 0

8 816 0

9 880.5 0 Shaker 1 location

10 943 0

11 1041 0

12 1068.3 0

13 199.8 270

14 313.9 270

15 382.6 270 Y accelerometer was switched from 8172 to 2563 before SS5-7 test

16 480.5 270

17 602 270

18 631.6 270

19 708.7 270

20 816.1 270

21 880 270 Shaker 2 location

22 995 270

23 995 90

24 995 180

25 1069.5 0

26 1069.5 267

27 1069.5 85

28 1069.5 180

29 400.2 180 Pre-Installed in LAS

30 995 0

31 874 5 Impedance head accelerometer at location 9

32 874 275 Impedance head accelerometer at location 21

33 - - Triaxial accelerometer mounted to shaker at location 9

34 - - Triaxial accelerometer mounted to shaker at location 21

Installed Location
46

Table C.2. Instrumentation Orientations

Location Orientation S/N Orientation S/N Orientation S/N Orientation S/N

1 -Y 2020 -Z 2021

2 Y 2608 Z 2610

3 Y 2595 Z 2588

4 Y 2585 Z 2607

5 -Y 2026 -Z 2027

6 Y 2606 Z 2605

7 Y 2584 Z 2601

8 Y 8171 -Z 8156

9 Y 8164 -Z 8140 -Z 1783

10 Y 8168 -Z 8159

11 -X 2603 Y 8177 Z 2577

12 -X 2599 Y 2582 Z 8157

13 Y 2586 Z 2578

14 Y 2675 Z 2596

15 Y 2563 Z 2615

16 Y 2614 Z 2673

17 Y 2679 Z 2591

18 Y 2671 Z 2676

19 Y 2751 Z 2567

20 -Y 8169 Z 8179

21 -Y 8161 Z 8176 -Y 1785

22 -X 8139 -Y 8181 Z 2569

23 -X 2579 Y 8138 Z 8167

24 -X 8160 Y 2562 Z 8142

25 -X 8163 Y 2570 Z 2576

26 -X 8166 Y 2597 Z 8180

27 -X 2609 Y 2598 Z 2583

28 -X 8178 Y 2587 Z 8165

29 -Y 2022 -Z 2023

30 -X 8162 Y 8141 -Z 8158

31 Z 1783

32 Y 1785

33 X 89390 Y 89390 Z 89390

34 X 89525 Y 89525 Z 89525

X-Axis Accel Y-Axis Accel Z-Axis Accel Load Cell
47

Table C.4. Transducer Channel Setup (1 of 2)

TRANSDUCER CHANNELS

Channel Usage Name EU Sensitivity Cal Type Input Mode Model Serial

1 Excitation SS5.9.Z- lbf 9.915 mV/EU Voltage 288M34 1783

2 Excitation SS5.21.Y- lbf 9.837 mV/EU Voltage 288M34 1785

3 Response SS5.9.Z- g 1020.0 mV/EU Voltage 3701M15 8140

4 Response SS5.21.Y- g 980.0 mV/EU Voltage 3701M15 8161

5 Response SS5.2.Y g 985.0 mV/EU Voltage 3701M15 2608

6 Response SS5.2.Z g 983.0 mV/EU Voltage 3701M15 2610

7 Response SS5.3.Y g 995.0 mV/EU Voltage 3701M15 2595

8 Response SS5.3.Z g 978.0 mV/EU Voltage 3701M15 2588

9 Response SS5.4.Y g 992.0 mV/EU Voltage 3701M15 2585

10 Response SS5.4.Z g 983.0 mV/EU Voltage 3701M15 2607

11 Response SS5.6.Y g 987.0 mV/EU Voltage 3701M15 2606

12 Response SS5.6.Z g 984.0 mV/EU Voltage 3701M15 2605

13 Response SS5.7.Y g 983.0 mV/EU Voltage 3701M15 2584

14 Response SS5.7.Z g 988.0 mV/EU Voltage 3701M15 2601

15 Response SS5.8.Y g 985.0 mV/EU Voltage 3701M15 8171

16 Response SS5.8.Z- g 990.0 mV/EU Voltage 3701M15 8156

17 Response SS5.9.Y g 1000.0 mV/EU Voltage 3701M15 8164

18 Response SS5.10.Y g 984.0 mV/EU Voltage 3701M15 8168

19 Response SS5.10.Z- g 997.0 mV/EU Voltage 3701M15 8159

20 Response SS5.11.Y g 983.0 mV/EU Voltage 3701M15 8177

21 Response SS5.11.Z g 989.0 mV/EU Voltage 3701M15 2577

22 Response SS5.12.X- g 991.0 mV/EU Voltage 3701M15 2599

23 Response SS5.12.Y g 997.0 mV/EU Voltage 3701M15 2582

24 Response SS5.12.Z g 999.0 mV/EU Voltage 3701M15 8157

25 Response SS5.13.Y g 981.0 mV/EU Voltage 3701M15 2586

26 Response SS5.13.Z g 984.0 mV/EU Voltage 3701M15 2578

27 Response SS5.14.Y g 988.0 mV/EU Voltage 3701M15 2675

28 Response SS5.14.Z g 988.0 mV/EU Voltage 3701M15 2596

29 Inactive g 988.0 mV/EU Voltage

30 Response SS5.15.Z g 992.0 mV/EU Voltage 3701M15 2615

31 Response SS5.16.Y g 974.0 mV/EU Voltage 3701M15 2614

32 Response SS5.16.Z g 985.0 mV/EU Voltage 3701M15 2673

33 Response SS5.17.Y g 981.0 mV/EU Voltage 3701M15 2679

34 Response SS5.17.Z g 990.0 mV/EU Voltage 3701M15 2591

35 Response SS5.18.Y g 984.0 mV/EU Voltage 3701M15 2671

36 Response SS5.18.Z g 991.0 mV/EU Voltage 3701M15 2676

37 Response SS5.19.Y g 982.0 mV/EU Voltage 3701M15 2571

38 Response SS5.19.Z g 989.0 mV/EU Voltage 3701M15 2567

39 Response SS5.20.Y- g 990.0 mV/EU Voltage 3701M15 8169

40 Response SS5.20.Z g 980.0 mV/EU Voltage 3701M15 8179
48

Table C.4. Transducer Channel Setup (2 of 2)

TRANSDUCER CHANNELS

Channel Usage Name EU Sensitivity Cal Type Input Mode Model Serial

41 Response SS5.21.Z g 984.0 mV/EU Voltage 3701M15 8176

42 Response SS5.22.X- g 977.0 mV/EU Voltage 3701M15 8139

43 Response SS5.22.Y- g 988.0 mV/EU Voltage 3701M15 8181

44 Response SS5.22.Z g 991.0 mV/EU Voltage 3701M15 2569

45 Response SS5.23.X- g 984.0 mV/EU Voltage 3701M15 2579

46 Response SS5.23.Y g 976.0 mV/EU Voltage 3701M15 8138

47 Response SS5.23.Z g 989.0 mV/EU Voltage 3701M15 8167

48 Response SS5.24.X- g 983.0 mV/EU Voltage 3701M15 8160

49 Response SS5.24.Y g 975.0 mV/EU Voltage 3701M15 2562

50 Response SS5.24.Z g 999.0 mV/EU Voltage 3701M15 8142

51 Response SS5.25.X- g 981.0 mV/EU Voltage 3701M15 8163

52 Response SS5.25.Y g 980.0 mV/EU Voltage 3701M15 2570

53 Response SS5.25.Z g 975.0 mV/EU Voltage 3701M15 2576

54 Response SS5.26.X- g 992.0 mV/EU Voltage 3701M15 8166

55 Response SS5.26.Y g 997.0 mV/EU Voltage 3701M15 2597

56 Response SS5.26.Z g 994.0 mV/EU Voltage 3701M15 8180

57 Response SS5.27.X- g 981.0 mV/EU Voltage 3701M15 2609

58 Response SS5.27.Y g 1000.0 mV/EU Voltage 3701M15 2598

59 Response SS5.27.Z g 986.0 mV/EU Voltage 3701M15 2583

60 Response SS5.28.X- g 981.0 mV/EU Voltage 3701M15 8178

61 Response SS5.28.Y g 991.0 mV/EU Voltage 3701M15 2587

62 Response SS5.28.Z g 980.0 mV/EU Voltage 3701M15 8165

63 Response SS5.1.Y- g 996.6 mV/EU Voltage 3701G3FA3G 2020

64 Response SS5.1.Z g 1009.3 mV/EU Voltage 3701G3FA3G 2021

65 Response SS5.5.Y- g 991.0 mV/EU Voltage 3701G3FA3G 2026

66 Response SS5.5.Z g 1003.9 mV/EU Voltage 3701G3FA3G 2027

67 Response SS5.29.Y- g 995.9 mV/EU Voltage 3701G3FA3G 2022

68 Response SS5.29.Z g 991.0 mV/EU Voltage 3701G3FA3G 2023

69 Response SS5.31.Z g 100.3 mV/EU Voltage 288M34 1783

70 Response SS5.32.Y g 99.0 mV/EU Voltage 288M34 1785

71 Response SS5.33.X g 9.99 mV/EU Voltage 356B21 89390

72 Response SS5.33.Y g 9.99 mV/EU Voltage 356B21 89390

73 Response SS5.33.Z g 9.71 mV/EU Voltage 356B21 89390

74 Response SS5.34.X g 10.00 mV/EU Voltage 356B21 89525

75 Response SS5.34.Y g 10.11 mV/EU Voltage 356B21 89525

76 Response SS5.34.Z g 9.95 mV/EU Voltage 356B21 89525

77 Response SS5.11.X- g 984.0 mV/EU Voltage 3701M15 2603

78 Response SS5.30.X- g 965.0 mV/EU Voltage 3701M15 8162

79 Response SS5.30.Y g 977.0 mV/EU Voltage 3701M15 8141

80 Response SS5.30.Z- g 987.0 mV/EU Voltage 3701M15 8158

81 Response SS5.15.Y g 988.0 mV/EU Voltage 3701M15 2563
49

Table C.5. Acquisition Channel Setup (1 of 2)

INPUT CHANNELS

Channel Coupling Range Offset Pre-gain Weighting

1 DC Gnd 10 V 0 1 Off

2 DC Gnd 10 V 0 1 Off

3 DC Gnd 10 V 0 1 Off

4 DC Gnd 10 V 0 1 Off

5 DC Gnd 10 V 0 1 Off

6 DC Gnd 10 V 0 1 Off

7 DC Gnd 10 V 0 1 Off

8 DC Gnd 10 V 0 1 Off

9 DC Gnd 10 V 0 1 Off

10 DC Gnd 10 V 0 1 Off

11 DC Gnd 10 V 0 1 Off

12 DC Gnd 10 V 0 1 Off

13 DC Gnd 10 V 0 1 Off

14 DC Gnd 10 V 0 1 Off

15 DC Gnd 10 V 0 1 Off

16 DC Gnd 10 V 0 1 Off

17 DC Gnd 10 V 0 1 Off

18 DC Gnd 10 V 0 1 Off

19 DC Gnd 10 V 0 1 Off

20 DC Gnd 10 V 0 1 Off

21 DC Gnd 10 V 0 1 Off

22 DC Gnd 10 V 0 1 Off

23 DC Gnd 10 V 0 1 Off

24 DC Gnd 10 V 0 1 Off

25 DC Gnd 10 V 0 1 Off

26 DC Gnd 10 V 0 1 Off

27 DC Gnd 10 V 0 1 Off

28 DC Gnd 10 V 0 1 Off

29 DC Gnd 10 V 0 1 Off

30 DC Gnd 10 V 0 1 Off

31 DC Gnd 10 V 0 1 Off

32 DC Gnd 10 V 0 1 Off

33 DC Gnd 10 V 0 1 Off

34 DC Gnd 10 V 0 1 Off

35 DC Gnd 10 V 0 1 Off

36 DC Gnd 10 V 0 1 Off

37 DC Gnd 10 V 0 1 Off

38 DC Gnd 10 V 0 1 Off

39 DC Gnd 10 V 0 1 Off

40 DC Gnd 10 V 0 1 Off
50

Table C.5. Acquisition Channel Setup (2 of 2)

INPUT CHANNELS

Channel Coupling Range Offset Pre-gain Weighting

41 DC Gnd 10 V 0 1 Off

42 DC Gnd 10 V 0 1 Off

43 DC Gnd 10 V 0 1 Off

44 DC Gnd 10 V 0 1 Off

45 DC Gnd 10 V 0 1 Off

46 DC Gnd 10 V 0 1 Off

47 DC Gnd 10 V 0 1 Off

48 DC Gnd 10 V 0 1 Off

49 DC Gnd 10 V 0 1 Off

50 DC Gnd 10 V 0 1 Off

51 DC Gnd 10 V 0 1 Off

52 DC Gnd 10 V 0 1 Off

53 DC Gnd 10 V 0 1 Off

54 DC Gnd 10 V 0 1 Off

55 DC Gnd 10 V 0 1 Off

56 DC Gnd 10 V 0 1 Off

57 DC Gnd 10 V 0 1 Off

58 DC Gnd 10 V 0 1 Off

59 DC Gnd 10 V 0 1 Off

60 DC Gnd 10 V 0 1 Off

61 DC Gnd 10 V 0 1 Off

62 DC Gnd 10 V 0 1 Off

63 DC Gnd 10 V 0 1 Off

64 DC Gnd 10 V 0 1 Off

65 DC Gnd 10 V 0 1 Off

66 DC Gnd 10 V 0 1 Off

67 DC Gnd 10 V 0 1 Off

68 DC Gnd 10 V 0 1 Off

69 DC Gnd 10 V 0 1 Off

70 DC Gnd 10 V 0 1 Off

71 DC Gnd 10 V 0 1 Off

72 DC Gnd 10 V 0 1 Off

73 DC Gnd 10 V 0 1 Off

74 DC Gnd 10 V 0 1 Off

75 DC Gnd 10 V 0 1 Off

76 DC Gnd 10 V 0 1 Off

77 DC Gnd 10 V 0 1 Off

78 DC Gnd 10 V 0 1 Off

79 DC Gnd 10 V 0 1 Off

80 DC Gnd 10 V 0 1 Off

81 DC Gnd 10 V 0 1 Off
51

Table C.6. Channel Connectivity (1 of 2)

SIGNAL CONDITIONER CHANNELS PATCH PANEL VXI CHANNELS

Channel Box Channel Type Cable Connector Box Channel Card Group

1 1 1 ICP BNC 1 1 1 1

2 1 2 ICP BNC 1 2 1 1

3 2 3 Capacitive BNC 1 3 1 1

4 2 4 Capacitive BNC 1 4 1 1

5 2 5 Capacitive Agilent 2 1 2

6 2 6 Capacitive Agilent 2 1 2

7 2 7 Capacitive Agilent 2 1 2

8 2 8 Capacitive Agilent 2 1 2

9 2 9 Capacitive Agilent 3 1 3

10 2 10 Capacitive Agilent 3 1 3

11 2 11 Capacitive Agilent 3 1 3

12 2 12 Capacitive Agilent 3 1 3

13 2 13 Capacitive Agilent 4 1 4

14 2 14 Capacitive Agilent 4 1 4

15 2 15 Capacitive Agilent 4 1 4

16 2 16 Capacitive Agilent 4 1 4

17 3 1 Capacitive Agilent 1 2 1

18 3 2 Capacitive Agilent 1 2 1

19 3 3 Capacitive Agilent 1 2 1

20 3 4 Capacitive Agilent 1 2 1

21 3 5 Capacitive Agilent 2 2 2

22 3 6 Capacitive Agilent 2 2 2

23 3 7 Capacitive Agilent 2 2 2

24 3 8 Capacitive Agilent 2 2 2

25 3 9 Capacitive Agilent 3 2 3

26 3 10 Capacitive Agilent 3 2 3

27 3 11 Capacitive Agilent 3 2 3

28 3 12 Capacitive Agilent 3 2 3

29 3 13 Capacitive Agilent 4 2 4

30 3 14 Capacitive Agilent 4 2 4

31 3 15 Capacitive Agilent 4 2 4

32 3 16 Capacitive Agilent 4 2 4

33 4 1 Capacitive Agilent 1 3 1

34 4 2 Capacitive Agilent 1 3 1

35 4 3 Capacitive Agilent 1 3 1

36 4 4 Capacitive Agilent 1 3 1

37 4 5 Capacitive Agilent 2 3 2

38 4 6 Capacitive Agilent 2 3 2

39 4 7 Capacitive Agilent 2 3 2

40 4 8 Capacitive Agilent 2 3 2
52

Table C.6. Channel Connectivity (2 of 2)

TRANSDUCER CHANNELS SIGNAL CONDITIONER CHANNELS PATCH PANEL VXI CHANNELS

Channel Box Channel Type Cable Connector Box Channel Card Group

41 4 9 Capacitive Agilent 3 3 3

42 4 10 Capacitive Agilent 3 3 3

43 4 11 Capacitive Agilent 3 3 3

44 4 12 Capacitive Agilent 3 3 3

45 4 13 Capacitive Agilent 4 3 4

46 4 14 Capacitive Agilent 4 3 4

47 4 15 Capacitive Agilent 4 3 4

48 4 16 Capacitive Agilent 4 3 4

49 5 1 Capacitive Agilent 1 4 1

50 5 2 Capacitive Agilent 1 4 1

51 5 3 Capacitive Agilent 1 4 1

52 5 4 Capacitive Agilent 1 4 1

53 5 5 Capacitive Agilent 2 4 2

54 5 6 Capacitive Agilent 2 4 2

55 5 7 Capacitive Agilent 2 4 2

56 5 8 Capacitive Agilent 2 4 2

57 5 9 Capacitive Agilent 3 4 3

58 5 10 Capacitive Agilent 3 4 3

59 5 11 Capacitive Agilent 3 4 3

60 5 12 Capacitive Agilent 3 4 3

61 5 13 Capacitive BNC 2 1 4 4

62 5 14 Capacitive BNC 2 2 4 4

63 6 1 Capacitive BNC 2 3 4 4

64 6 2 Capacitive BNC 2 4 4 4

65 6 3 Capacitive BNC 2 5 5 1

66 6 4 Capacitive BNC 2 6 5 1

67 6 5 Capacitive BNC 2 7 5 1

68 6 6 Capacitive BNC 2 8 5 1

69 1 3 ICP BNC 1 5 5 2

70 1 4 ICP BNC 1 6 5 2

71 1 5 ICP BNC 1 7 5 2

72 1 6 ICP BNC 1 8 5 2

73 1 7 ICP BNC 3 1 5 3

74 1 8 ICP BNC 3 2 5 3

75 1 9 ICP BNC 3 3 5 3

76 1 10 ICP BNC 3 4 5 3

77 2 1 Capacitive BNC 3 5 5 4

78 2 2 Capacitive BNC 3 6 5 4

79 5 15 Capacitive BNC 3 7 5 4

80 5 16 Capacitive BNC 3 8 5 4

81 6 1 Capacitive BNC 4 1 6 1
53

Appendix D: Data Acquisition Log

Pre-Test Setup and Checkout

SS5-1: May 26, 2009; Ambient noise data, 128 Hz sample rate, 0.03125 Hz resolution, 20 

blocks; Umbilical cover installed but not all bolts installed; impedance sensors and shaker 

accelerometers not installed

Note that SS5-2 was conducted out of chronological order

SS5-3: May 26, 2009; Impact data (16Y-, 4Z-, 9Z-), 128 Hz sample rate, 8 second block, 0. 125 

Hz resolution, 5 averages, 10% force window, 100% (Uniform) response window; Umbilical 

cover installed but not all bolts installed; impedance sensors and shaker accelerometers not 

installed; need to check data for possible saturation of accelerometers near drive point; only 

frequency domain data stored

SS5-4: May 27, 2009; Impact data (21Y-), 128 Hz sample rate, 8 second block, 0. 125 Hz 

resolution, 5 averages, 10% force window, 100% (Uniform) response window; Umbilical cover 

installed but not all bolts installed; impedance sensors and shaker accelerometers not installed; 

only frequency domain data stored

SS5-2: May 27, 2009; Ambient noise data, 128 Hz sample rate, 0.03125 Hz resolution, 20 

blocks; fans shutdown, no work in bay; impedance sensors and shaker accelerometers not 

installed

Test Day

Shaker setup and installation; May 29, 2009 (7:30 AM- Noon); shakers centered 12 inches above 

SA/SM interface; Shaker 1 (9Z-) 5 degree angle; Shaker 2 (21Y-) 275 degree angle

SS5-5: May 29, 2009 (~1:30 pm start); Burst random (9Z-, 21Y-), 75% burst, ~8 lb-rms; 128 Hz 

sample rate, 0.03 125 Hz resolution, 20 averages, uniform window; response of LAS 

accelerometers does not decay fully in sample period—need to reduce burst percentage

SS5-6: May 29, 2009 (~2:34 pm start); Burst random (9Z-, 21Y-), 50% burst, ~20 lb-rms; 128 

Hz sample rate, 0.03 125 Hz resolution, 20 averages, uniform window; 15Y identified as bad 

channel –cable and transducer replaced (newe transducer S/N 2563, 988 mv/g) 

SS5-7: May 29, 2009 (~3:15 pm start); Burst random (9Z-, 21Y-), 50% burst, ~20 lb-rms; 128 

Hz sample rate, 0.03 125 Hz resolution, 40 averages, uniform window; 15Y out again—

Amplifier #3 channel 13 bad (VXI channel 29)—rerouted to VXI channel 81

SS5-8: May 29, 2009 (~4:24 pm start); Burst random (9Z-, 21Y-), 50% burst, ~50 lb-rms; 128 

Hz sample rate, 0.03 125 Hz resolution, 40 averages, uniform window; Noticeable audible rattle 

internal—―thunder‖ sound 
54

SS5-9: May 29, 2009 (~5:06 pm start); Burst random (9Z-, 21Y-), 50% burst, ~90 lb-rms; 128 

Hz sample rate, 0.03 125 Hz resolution, 20 averages, uniform window; Noticeable audible rattle 

internal—―thunder‖ sound; telehandler motion observed

SS5-10: May 29, 2009; Ambient data, 128 Hz sample rate, 0.03 125 Hz resolution, 40 averages; 

9Z was disconnected from shaker/stinger rod removed

SS5-11: May 29, 2009 (~6:50 pm start); Sine sweep ( 21Y-), mode 2 characterization, 3.75 to 

4.84 Hz; 10 lb-pk at 1 Hz/min; Run 2: 20 lb-pk at .5 Hz/min; Run 3: 20 lb-pk at .25 Hz/min, 

Range changed to 4.05 to 4.34 Hz for runs 4-6; Run 4: 20 lb-pk at .1 Hz/min; Run 5: 50 lb-pk at 

.1 Hz/min; Run 6: 100 lb-pk at .1 Hz/min

SS5-12: May 29, 2009 (~8:36 pm start); Sine sweep ( 21Y-), mode 4 characterization, 9.22 to 

10.32 Hz; Run 1: 20 lb-pk at .2 Hz/min; Run 2: 100 lb-pk at .2 Hz/min

SS5-13: May 29, 2009 (~9:26 pm start); Sine sweep (9Z-), mode 3 characterization, 8.34 to 9.31 

Hz; Run 1: 20 lb-pk at .2 Hz/min; Run 2: 100 lb-pk at .2 Hz/min

Post Test De-brief (~10 pm); based on quick look assessment data is satisfactory for calibration; 

ready to break configuration

Disconnected shakers and removed telehandlers; data acquisition system prepared for storage
55

Appendix E: Test Mode Shapes

Figure E.1. Test geometry with measurement points labeled. 
56

Figure E.2. Test mode 1; LAS 1

st Bending. 
57

Figure E.3. Test mode 2; LAS 1

st Bending. 
58

Figure E.4. Test mode 3; System Bending (X-Z Plane). 
59

Figure E.5. Test mode 4; System Bending (X-Y Plane). 
60

Figure E.6. Test mode 5; LAS 2nd Bending. 
61

Figure E.7. Test mode 6; LAS 2

nd Bending. 
REPORT DOCUMENTATION PAGE Form Approved

OMB No. 0704-0188

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Technical Memorandum

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Ares I-X Flight Test Vehicle: Stack 5 Modal Test 

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 6. AUTHOR(S)

Buehrle, Ralph D.; Templeton, Justin D.; Reaves, Mercedes, C.; Horta, 

Lucas G.; Gaspar, James L.; Bartoletta, Paul A.; Parks, Russel A.; Lazor, 

Daniel R.

 7. PERFORMING ORGANIZATION NAME(S) AND ADDRESS(ES)

NASA Langley Research Center

Hampton, VA 23681-2199

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National Aeronautics and Space Administration

Washington, DC 20546-0001

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L-19811

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NASA

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Ares I-X was the first flight test vehicle used in the development of NASA’s Ares I crew launch vehicle. The Ares I-X used a 

4-segment reusable solid rocket booster from the Space Shuttle heritage with mass simulators for the 5th segment, upper stage, 

crew module and launch abort system. Three modal tests were defined to verify the dynamic finite element model of the Ares 

I-X flight test vehicle. Test configurations included two partial stacks and the full Ares I-X flight test vehicle on the Mobile 

Launcher Platform. This report focuses on the first modal test that was performed on the top section of the vehicle referred to

as Stack 5, which consisted of the spacecraft adapter, service module, crew module and launch abort system simulators. This 

report describes the test requirements, constraints, pre-test analysis, test operations and data analysis for the Ares I-X Stack 5 

modal test.

15. SUBJECT TERMS

Flight test vehicles; Modal parameters; Modal test; Verification

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136905.10.10.20.20

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01- 01 - 2010