# Patent

## Title
Failure analysis and testing of semi-conductor devices using intelligent software on automated test equipment (ATE)

## Abstract

The invention provides a number of related methods which improve the test and analysis of integrated circuit devices. A first method of the invention provides a method for pausing on a SCAN based test. A second method of the invention provides a method for using stimulations and responses of a known good device to increase fault coverage of patterns in a test flow. A third method of the invention provides a method to curve trace device buffers on an ATE.

## Background
BACKGROUND
The invention generally applies to the test and analysis of Integrated Circuit devices.
The inherent software and hardware architecture of many Automatic Test Equipment (ATE) platforms do not allow for pauses during the execution of serialized SCAN based tests. However, many of the failure analysis techniques require the ability to pause on a test, such as SCAN, in order to perform many of the tasks associated with a root cause failure analysis. For example, in order to collect electrical current measurements on pattern vectors the test must be paused at each vector, the device under test is conditioned as desired, and then an electrical current measurement is made. The test is then resumed, the next vector is executed, the test is paused, the device under test is conditioned as desired, and then an electrical current measurement is made, and so forth.
Currently, SCAN based patterns use a combination of parallel and serial vectors in order to reduce the amount of memory used on many ATE platforms. Typically, an ATE platform will provide the ability to pause on a parallel vector, so one method of pausing on serial vectors of a SCAN based test is to convert the serial vectors into parallel vectors. This existing approach of converting the serialized vectors to parallel vectors, however, has a number of disadvantages.
First of all, when the serial vectors in a SCAN pattern are converted to parallel vectors, the pattern becomes very large. Many times the pattern becomes so large that it will not fit into the tester's parallel vector memory. Therefore, the method will not work. At other times, the pattern will fit, but the other patterns in the test program have to be removed to make room for the converted SCAN pattern. This requires extensive modifications to the test program.
Second, converting the serialized vectors to parallel vectors and then modifying the test program to accommodate them is typically outside the expertise of the typical personnel who are responsible for failure analysis tasks. Therefore, this method is seldom used because of the inherent problems it creates on tester resources and test program code.
Third, once the serial vectors are converted, the patterns must be recompiled, the test program must be modified, and, if there are several SCAN patterns failing, these tasks are required for each failing pattern. This effort becomes very time consuming and often times required the assistance of a Test Engineer. Therefore, it is both costly and impacts the cycle time required to complete the failure analysis on a device.
Device simulations are used by integrated circuit design engineers to generate patterns that are used in the test of a device. However, due to design and logic layouts there are areas of a device that cannot be simulated. This leads to a decrease in the test fault coverage that in turn leads to devices that pass all production test flows, but fail in the customer applications.
In order to solve this problem, sometimes there are opportunities to re-simulate a design to increase the fault coverage. However, in many cases the logic cannot be simulated. Another alternative is to re-spin the design to add logic that allows for additional simulation, but this isn't always practical and is seldom done.
These existing approaches, however, has a number of disadvantages. First, re-simulation and re-design are very costly. Second, re-simulation and re-design can take many months to accomplish, which is unacceptable in a time-to-market environment. Third, re-simulation and re-design are not always successful. Fourth, re-designing a part can lead to other problems. In other words, sometimes the new design doesn't work and another re-spin is required.
A current computer program has been designed to function on the Credence automatic test equipment (ATE) platform, however, the features provided by the software can be written to work across different ATE platforms. The program provides the ability to curve trace the input and output pin (buffer) characteristics of a device under test. This is also known as curve tracing. The program is incorporated into the test program and use the standard Credence ATE test and debugger elementals to characterize the buffers and then stores the data for further analysis. This eliminates the need to use additional offline equipment to characterize and curve trace device buffers. The program provides the option of either viewing the curve traces during a tester session using the standard UNIX 2D plot routine (GNUPLOT) or an offline software package such as Microsoft EXCEL. Of course, other graphic packages exist that could utilize the data as well. The program also provides the capability to store data that can then be evaluated using offline statistical and mathematically analysis packages to evaluate and characterize the buffers. Thus, the program offers the ability to curve trace buffers during a test session and then store the data for offline evaluation.
The known approach for solving this problem is oscilloscopes, which are used to curve trace. Oscilloscopes, though, are cumbersome to use when large numbers of buffers are to be examined. Oscilloscopes are lacking for a number of different reasons. In particular, oscilloscopes: do not automatically curve trace a user defined pin list; do not utilize the existing automatic test equipments hardware and software utilities; must be manually set up for each pin which can be very time consuming and costly; do not provide a data file for a group of pins that can be analyzed offline; do not provide an interface to the existing UNIX gnuplot utility; do not provide test limit and alarming capability; and do not provide an operator interface that resides in the ATE test programs flow.
OBJECTS AND SUMMARY
A primary object of an embodiment of the invention is to provide the capability to pause on any link within a chain on any ATE that utilizes looping and SCAN memory.
Another primary object of an embodiment of the invention is to provide the capability to pause on any link in a SCAN pattern, but which does not require any permanent changes to the SCAN pattern or test program flow.
Yet another primary object of an embodiment of the invention is that it uses the stimulations and responses of a known good device to increase the fault coverage of the patterns in the test flow by changing the patterns to include additional strobes in the pattern vectors that could not be determined during simulations.
Still another primary object of an embodiment of the invention is to provide the availability to easily and automatically curve trace device buffers on an ATE.
Briefly, and in accordance with the foregoing, the invention provides a number of related methods which improve the test and analysis of integrated circuit devices. A first method of the invention provides a method for pausing on a SCAN based test. A second method of the invention provides a method for using stimulations and responses of a known good device to increase fault coverage of patterns in a test flow. A third method of the invention provides a method to curve trace device buffers on an ATE.



BRIEF DESCRIPTION OF THE DRAWINGS
The features of the invention which are believed to be novel are described in detail hereinbelow. The organization and manner of the structure and operation of the invention, together with further objects and advantages thereof, may best be understood by reference to the following description taken in connection with the accompanying drawings wherein like reference numerals identify like elements in which:
FIG. 1 illustrates a flow chart depicting a first method of the invention;
FIG. 2 illustrates a flow chart depicting a second method of the invention; and
FIG. 3 illustrates a flow chart depicting a third method of the invention.



DESCRIPTION
While the invention may be susceptible to embodiment in different forms, there is shown in the drawings, and herein will be described in detail, specific embodiments of the invention. The present disclosure is to be considered an example of the principles of the invention, and is not intended to limit the invention to that which is illustrated and described herein.
The invention provides a method 100 for pausing on a SCAN based test. The method 100 uses a unique technique to force the ATE to halt execution of the SCAN pattern at any link in a scan chain for any number of SCAN partitions. The method 100 includes a number of individual steps, as illustrated in FIG. 1.
The method 100 preferably begins with step 102, which is to read the SCAN chain data for a SCAN partition.
Step 104 of the method 100 is to save the original SCAN chain data.
Step 106 of the method 100 is to rewrite the SCAN chain data with a walking or standing strobe character, such as an “L”, at the link in the chain where the pause is desired. For example, if the original SCAN chain data had fifteen (15) links, and those links included the following strobe characters: XXXXXLHHHLLHLHL, the links could be rewritten for each execution of the parallel partition as displayed in Table 1.























TABLE 1







Link
Link
Link
Link
Link
Link
Link
Link
Link
Link
Link
Link
Link
Link
Link



01
02
03
04
05
06
07
08
09
10
11
12
13
14
15































Execution 01 SCAN Data:
L
X
X
X
X
X
X
X
X
X
X
X
X
X
X


Execution 02 SCAN Data:
X
L
X
X
X
X
X
X
X
X
X
X
X
X
X


Execution 03 SCAN Data:
X
X
L
X
X
X
X
X
X
X
X
X
X
X
X


Execution 04 SCAN Data:
X
X
X
L
X
X
X
X
X
X
X
X
X
X
X


Execution 05 SCAN Data:
X
X
X
X
L
X
X
X
X
X
X
X
X
X
X


Execution 06 SCAN Data:
X
X
X
X
X
L
X
X
X
X
X
X
X
X
X


Execution 07 SCAN Data:
X
X
X
X
X
X
L
X
X
X
X
X
X
X
X


Execution 08 SCAN Data:
X
X
X
X
X
X
X
L
X
X
X
X
X
X
X


Execution 09 SCAN Data:
X
X
X
X
X
X
X
X
L
X
X
X
X
X
X


Execution 10 SCAN Data:
X
X
X
X
X
X
X
X
X
L
X
X
X
X
X


Execution 11 SCAN Data:
X
X
X
X
X
X
X
X
X
X
L
X
X
X
X


Execution 12 SCAN Data:
X
X
X
X
X
X
X
X
X
X
X
L
X
X
X


Execution 13 SCAN Data:
X
X
X
X
X
X
X
X
X
X
X
X
L
X
X


Execution 14 SCAN Data:
X
X
X
X
X
X
X
X
X
X
X
X
X
L
X


Execution 15 SCAN Data:
X
X
X
X
X
X
X
X
X
X
X
X
X
X
L









Step 108 of the method 100 is to set the compare level for output pin associated with the walking or standing character so that a device under test (DUT) failure results when the ATE executes the SCAN partition. For example, the compare level would be set to −1.0 volt, which will cause the output low “L” strobe to fail.
Step 110 of the method 100 is to mask all output pins except for the output pin with the walking or standing strobe character.
Step 112 of the method 1100 is to execute the partition to failure. The test will thus be suspended or paused during the execution of the partition at the link in the chain where the walking or standing strobe resides.
Step 114 of the method 100 is to perform any other tasks required during the paused condition.
Step 116 is to determine whether a pause is necessary on another link. If another pause is necessary, return to step 106 of the method 100 and again follow steps 106, 108, 110, 112, 114 and 116. If another pause if not necessary, move forward to step 118 of the method 100. In other words, the method 100 can be used to stop on a specific link within a chain as opposed to successive links within a chain. For example, if a user only wants to stop on link 10, as shown in TABLE 1, then the ATE's SCAN memory would only be suspended or paused once with the information shown in “Execution 10 SCAN Data”.
Step 118 is to rewrite the original SCAN chain characters back to the ATE's SCAN memory, which was saved in step 104 of the method 100. The method 100 finishes with the completion of step 118. Thus, the original SCAN pattern exists once the user is finished with the method 100.
A walking “H” or some other strobe character with the appropriate compare level that would cause a failure may also be used to initiate the pause condition. The characters preceding the walking strobe characters, as shown in TABLE 1, are don't care “X” characters. These don't care “X” characters prevent a failure from occurring prior to the walking strobe character. The characters that follow the walking strobe characters, an “X” as shown in TABLE 1, are of no consequence because the walking strobe character is what causes the failure and curtails the test. The walking strobe character pauses the test at the desired link in the chain.
Although a SCAN based pattern may include multiple chains, the method 100 only requires that the walking strobe or standing strobe be placed on any one chain since all of the chains are executed simultaneously. The output pins on the other chains are masked in step 110 so that only the chain with the walking strobe causes the pause state for all chains irrespective of their output strobe characters.
The method 100 thus provides the capability to pause on any link within a chain on any ATE that utilizes looping and SCAN memory. The method 100 further provides the capability to pause on any link in a SCAN pattern, but it does not require any permanent changes to the SCAN pattern or test program flow. Thus, the method 100 does not have any of the disadvantages associated with the existing approaches, as described in the Background section.
Also, although the method 100 is geared toward applications involving serialized pattern vectors, it can be utilized in applications involving parallel vector patterns as well. However, ATE's typically provide other methods for pausing on parallel vectors.
Tables 2–4 provide an example use of a walking strobe to collect IDD data while paused on the chain links of a SCAN based pattern. Table 2 is an actual data log of failures when using a walking “L” strobe character on a SCAN based pattern with Partitions 40–41: Chains 0–255. Table 3 is an actual data log of a test program run using a walking “L” strobe character to collect IDD data while paused on the links of a chain in a SCAN based pattern with Partitions 40–41: Chains 0–255. Table 4 is actual IDD data that was collected by using a walking “L” strobe character to pause on the links of a chain in a SCAN based pattern with Partitions 40–41: Chains 0–255.







TABLE 2







script file ‘example_run.log’ is opened


begin> data fct


begin> pause test blkll


begin>


 STDF Version 4 has been enabled


STDF collection file ‘/home3/STDF/coll_UNSPECIFIED.std’ is opened.









BLK_OS_FUN_CON
 8 to 342
pass


BLK_OS_FUN_SRT
 8 to 342
pass


f res


BLK_A_FUNC_MIN
  360 to 235519
pass


BLK_B1_FUNC_MIN
235520 to 315127
pass


BLK_B2_FUNC_MIN
315128 to 490479
pass


BLK_C1_FUNC_MIN
490480 to 660943
pass


BLK_C3_FUNC_MIN
660944 to 798527
pass


BLK_C5_FUNC_MIN
 798528 to 1042919
pass


BLK_C6_FUNC_MIN
1042920 to 1121375
pass


BLK_C7_FUNC_MIN
1121376 to 1191319
pass


BLK_D1_FUNC_MIN
1191320 to 1207167
pass


BLK_D2_FUNC_MIN
1207168 to 1239743
pass


BLK_D3_FUNC_MIN
1239744 to 1369391
pass


BLK_E1_FUNC_MIN
1369392 to 1704319
pass


BLK_E2_FUNC_MIN
1704320 to 2135047
pass


BLK_E3_FUNC_MIN
2135048 to 2191079
pass


BLK_E4_FUNC_MIN
2191080 to 2349191
pass


BLK_F1_FUNC_MIN
2349192 to 2401743
pass


BLK_F2_FUNC_MIN
2401744 to 2725007
pass


BLK_H_FUNC_MIN
2725008 to 2731743
pass


BLK_Q_FUNC_MIN
2915464 to 2958815
pass


BLK_G_FUNC_MIN
2890472 to 2901951
pass







Pause in “BLKL1” due to test name


test_name(name=“BLKL1”)


break> pause fct


break>









BLK_L1_FAST_SCAN
2958816 to 2960439
pass







Pause in “BLK_L1_FAST_SCAN” due to functional pass


func_test(func_pins = OBPIN, start_vec = 2958816 , stop_vec = 2960439)










break> data fail





break> faq


BLK_L1_FAST_SCAN

2959030 to 2959045
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959041 1  522


SC  40:0  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959030 to 2959045
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959041 2  523


SC  40:1  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959030 to 2959045
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959041 3  524


SC  40:2  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959030 to 2959045
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959041 4  525


SC  40:3  Cnt 3
.D249_TX_DI P23


.


.


.


.


.


BLK_L1_FAST_SCAN

2959030 to 2959045
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959041 251  772


SC  40:250  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959030 to 2959045
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959041 252  773


SC  40:251  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959030 to 2959045
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959041 253  774


SC  40:252  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959030 to 2959045
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959041 254  775


SC  40:253  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959030 to 2959045
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959041 255  776


SC  40:254  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959030 to 2959045
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959041 256  777


SC  40:255  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959035 to 2959050
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959046 1  522


SC  41:0  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959035 to 2959050
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959046 2  523


SC  41:1  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959035 to 2959050
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959046 3  524


SC  41:2  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959035 to 2959050
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959046 4  525


SC  41:3  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959035 to 2959050
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959046 5  526


SC  41:4  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959035 to 2959050
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959046 6  527


SC  41:5  Cnt 3
.D249_TX_DI P23


.


.


.


.


.


.


.


D249_TX_DI P23


BLK_L1_FAST_SCAN

2959035 to 2959050
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959046 251  772


SC  41:250  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959035 to 2959050
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959046 252  773


SC  41:251  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959035 to 2959050
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959046 253  774


SC  41:252  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959035 to 2959050
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959046 254  775


SC  41:253  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959035 to 2959050
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959046 255  776


SC  41:254  Cnt 3
.D249_TX_DI P23


BLK_L1_FAST_SCAN

2959035 to 2959050
*FAIL*


   LOW FAIL = .


  HIGH FAIL = /


 TRISTATE FAIL = *


 SX:NO COMPARE = −


Vector Loop Cycle
FAILED DUT PIN


2959046 256  777


SC  41:255  Cnt 3
.D249_TX_DI P23


break> quit









scansignolog2.txt







Enter {circumflex over ( )}A <advance> to start


   {circumflex over ( )}F <finish> to stop


   {circumflex over ( )}P    to pause


begin> data fct


begin> pause test blk11


begin>


 STDF Version 4 has been enabled


STDF collection file ‘/home3/STDF/coll_UNSPECIFIED.std’ is opened.









BLK_OS_FUN_CON
 8 to 342
pass


BLK_OS_FUN_SRT
 8 to 342
pass


BLK_A_FUNC_MIN
  360 to 235519
pass


BLK_B1_FUNC_MIN
235520 to 315127
pass


BLK_B2_FUNC_MIN
315128 to 490479
pass


BLK_C1_FUNC_MIN
490480 to 660943
pass


BLK_C3_FUNC_MIN
660944 to 798527
pass


BLK_C5_FUNC_MIN
 798528 to 1042919
pass


BLK_C6_FUNC_MIN
1042920 to 1121375
pass


BLK_C7_FUNC_MIN
1121376 to 1191319
pass


BLK_D1_FUNC_MIN
1191320 to 1207167
pass


BLK_D2_FUNC_MIN
1207168 to 1239743
pass


BLK_D3_FUNC_MIN
1239744 to 1369391
pass


BLK_E1_FUNC_MIN
1369392 to 1704319
pass


BLK_E2_FUNC_MIN
1704320 to 2135047
pass


BLK_E3_FUNC_MIN
2135048 to 2191079
pass


BLK_E4_FUNC_MIN
2191080 to 2349191
pass


BLK_F1_FUNC_MIN
2349192 to 2401743
pass


BLK_F2_FUNC_MIN
2401744 to 2725007
pass


BLK_H_FUNC_MIN
2725008 to 2731743
pass


BLK_Q_FUNC_MIN
2915464 to 2958815
pass


BLK_G_FUNC_MIN
2890472 to 2901951
pass







Pause in “BLKL1” due to test name


test_name(name=“BLKL1”)


break> pause fct


break>


Pause in “BLK_L1_FAST_SCAN” due to functional pass


func_test(func_pins = OBPIN, start_vec = 2958816 , stop_vec = 2960439)


break> data off


break> faq


For options 1, 2, and 4 you must already be paused


on the pattern of interest


For option 3 you must be paused on the functional


continuity test.


If you are not paused as required, choose option 5


to exit this menu to get to the required pause


location.


In addition, options 1 and 3 use a user defined pinlist


RMA that is initially set to ALLPIN. You can update


the RMA pinlist by using the interactive pinl command


prior to using options 1 and 3 of this routine.


Note: In many menus if you enter a −1 it will return


you to the test program flow.


Enter a 1 for ATESignature functional pattern analysis.


Enter a 2 for ATEPattern changing analysis.


Enter a 3 for ATECurve tracing analysis.


Enter a 4 for ATESignature scan pattern analysis.


Enter a 5 to return to the program.


Enter your selection: 4


 Enter the pattern start address: 2958816


PLEASE NOTE:


If the analysis is aborted prematurely (ex. cntl C)


the scan pattern will likely be corrupted.


If you log scan failures the run time will increase.


Scan patterns strobe information that was clocked


in in the previous partition. For example: if the


scan pattern is failing partition 12, you need to


include partition 11 in the analysis because the


input data on partition 11 is what is causing the


the output failures on partition 12.


Scan patterns strobe information that was clocked


in in the previous partition. For example: if the


scan pattern is failing partition 12, you need to


include partition 11 in the analysis because the


input data on partition 11 is what is causing the


the output failures on partition 12.


 Enter the first partition number for analysis: 40


 Enter the last partition number for analysis: 41


You may choose to use one power setting during the


pattern execution and another at the stop location


when the idd measurement is taken. Of course you


can use the same setting for both.


PS 1 is currently set to 2.500


Enter value to use during the pattern execution: 2.5


Enter value to use the during idd measurement: 2.5


Store the idd current for this supply [0=no, 1=yes]: 1


PS 2 is currently set to 2.500


Enter value to use during the pattern execution: 2.5


Enter value to use the during idd measurement: 2.65


Store the idd current for this supply [0=no, 1=yes]: 1


PS 3 is currently set to 5.001


Enter value to use during the pattern execution: 5


Enter value to use the during idd measurement: 5


Store the idd current for this supply [0=no, 1=yes]: 0


PS 4 is currently set to 4.994


Enter value to use during the pattern execution: 5


Enter value to use the during idd measurement: 5


Store the idd current for this supply [0=no, 1=yes]: 0


PS 5 is currently set to 2.502


Enter value to use during the pattern execution: 2.5


Enter value to use the during idd measurement: 2.65


Store the idd current for this supply [0=no, 1=yes]: 1


PS 6 is currently set to 1.502


Enter value to use during the pattern execution: 1.5


Enter value to use the during idd measurement: 1.5


Store the idd current for this supply [0=no, 1=yes]: 0


PS 7 is currently set to 0.752


Enter value to use during the pattern execution: .75


Enter value to use the during idd measurement: .75


Store the idd current for this supply [0=no, 1=yes]: 0


 MI = Measure Idd Flag


 CV = Current Voltage Setting


 RV = Pattern Run Voltage


 RV = MV = Voltage During Idd Measurement


Your power selections are:


PS 1: MI = 1, CV = 2.500 RV = 2.500 MV = 2.500


PS 2: MI = 1, CV = 2.500 RV = 2.500 MV = 2.650


PS 3: MI = 0, CV = 5.001 RV = 5.000 MV = 5.000


PS 4: MI = 0, CV = 4.994 RV = 5.000 MV = 5.000


PS 5: MI = 1, CV = 2.502 RV = 2.500 MV = 2.650


PS 6: MI = 0, CV = 1.502 RV = 1.500 MV = 1.500


PS 7: MI = 0, CV = 0.752 RV = 0.750 MV = 0.750


 Are these power settings correct [0 = no, 1 = yes:]1


Typically you will float any pins with an X, L, or H


pattern vector character when measuring IDD.


Enter a 1 to float X, L, and H pins.


Enter a 2 to keep them connected to the pin electronics.


Enter your selection: 1


Do not make the file name the same as the program name.


Enter the file name for saving the output:


examplerun.txt


Enter the file name for saving the output: examplerun.txt


The file examplerun.txt has been opened.


Number of scan pins = 2


Tester channel: 28 chain number: 0 pin type: SI index: 0


Tester channel: 22 chain number: 0 pin type: SO index: 1


Processing partition 40 of 41


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 Processing partition 41 of 41


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 break>
















TABLE 4







scansig_ex.txt







Test Date: Sep 1 2004


Test Time: 10:23:46


The program name is:  ./cima_scandev


This test is: BLK_L1_FAST_SCAN


Tester:  QRT8


RPS = PS Voltage During Pattern Run


MPS = PS Voltage During Measurement


RPS 1 = 2.50 MPS 1 = 2.50


RPS 2 = 2.50 MPS 2 = 2.65


RPS 3 = 5.00 MPS 3 = 5.00


RPS 4 = 5.00 MPS 4 = 5.00


RPS 5 = 2.50 MPS 5 = 2.65


RPS 6 = 1.50 MPS 6 = 1.50


RPS 7 = 0.75 MPS 7 = 0.75















RPS01=2.50
RPS02=2.50
RPS05=2.50


Partition
Link
Vector
MPS01=2.50
MPS02=2.65
MPS05=2.65















40
0
2959041
0.000027
0.000042
0.002514


40
1
2959041
0.000031
0.000041
0.002545


40
2
2959041
0.000030
0.000043
0.002607


40
3
2959041
0.000029
0.000040
0.002545


40
4
2959041
0.000028
0.000041
0.002545


40
5
2959041
0.000027
0.000040
0.002576


40
6
2959041
0.000030
0.000042
0.002482


40
7
2959041
0.000028
0.000041
0.002576


40
8
2959041
0.000027
0.000040
0.002545


40
9
2959041
0.000026
0.000040
0.002545


40
10
2959041
0.000025
0.000041
0.002576


40
11
2959041
0.000024
0.000038
0.002576


40
12
2959041
0.000029
0.000042
0.002545


40
13
2959041
0.000033
0.000041
0.002576


40
14
2959041
0.000027
0.000038
0.002545


40
15
2959041
0.000028
0.000044
0.002545


40
16
2959041
0.000027
0.000042
0.002545


40
17
2959041
0.000029
0.000041
0.002545


40
18
2959041
0.000030
0.000041
0.002545


40
19
2959041
0.000027
0.000037
0.002545


40
20
2959041
0.000028
0.000044
0.002545


40
21
2959041
0.000028
0.000042
0.002545


40
22
2959041
0.000028
0.000041
0.002545


40
23
2959041
0.000031
0.000042
0.002482


40
24
2959041
0.000029
0.000041
0.002576


40
25
2959041
0.000028
0.000042
0.002576


40
26
2959041
0.000029
0.000041
0.002576


40
27
2959041
0.000028
0.000039
0.002545


40
28
2959041
0.000029
0.000040
0.002545


40
29
2959041
0.000033
0.000041
0.002576


40
30
2959041
0.000029
0.000039
0.002545


40
31
2959041
0.000028
0.000043
0.002545


40
32
2959041
0.000031
0.000042
0.002545


40
33
2959041
0.000025
0.000041
0.002607


40
34
2959041
0.000031
0.000041
0.002545


40
35
2959041
0.000032
0.000041
0.002576


40
36
2959041
0.000028
0.000038
0.002576


40
37
2959041
0.000029
0.000037
0.002576


40
38
2959041
0.000027
0.000041
0.002576


40
39
2959041
0.000028
0.000043
0.002514


40
40
2959041
0.000029
0.000040
0.002576


40
41
2959041
0.000030
0.000045
0.002545


40
42
2959041
0.000032
0.000042
0.002451


40
43
2959041
0.000030
0.000045
0.002545


40
44
2959041
0.000027
0.000040
0.002576


40
45
2959041
0.000023
0.000038
0.002514


40
46
2959041
0.000027
0.000041
0.002545


40
47
2959041
0.000031
0.000042
0.002545


40
48
2959041
0.000033
0.000042
0.002607


40
49
2959041
0.000028
0.000041
0.002545


40
50
2959041
0.000030
0.000041
0.002545


40
51
2959041
0.000030
0.000042
0.002514


40
52
2959041
0.000029
0.000041
0.002545


40
53
2959041
0.000027
0.000042
0.002545


40
54
2959041
0.000029
0.000040
0.002545


40
55
2959041
0.000030
0.000039
0.002576


40
56
2959041
0.000029
0.000043
0.002576


40
57
2959041
0.000028
0.000040
0.002576


40
58
2959041
0.000029
0.000041
0.002545


40
59
2959041
0.000028
0.000042
0.002576


40
60
2959041
0.000027
0.000043
0.002576


40
61
2959041
0.000030
0.000041
0.002576


40
62
2959041
0.000031
0.000042
0.002576


40
63
2959041
0.000029
0.000042
0.002576


40
64
2959041
0.000029
0.000041
0.002545


40
65
2959041
0.000030
0.000043
0.002545


40
66
2959041
0.000029
0.000037
0.002576


40
67
2959041
0.000029
0.000040
0.002545


40
68
2959041
0.000029
0.000040
0.002576


40
69
2959041
0.000031
0.000040
0.002576


40
70
2959041
0.000029
0.000042
0.002545


40
71
2959041
0.000030
0.000042
0.002545


40
72
2959041
0.000030
0.000041
0.002545


40
73
2959041
0.000029
0.000041
0.002576


40
74
2959041
0.000028
0.000042
0.002576


40
75
2959041
0.000028
0.000039
0.002545


40
76
2959041
0.000030
0.000040
0.002607


40
77
2959041
0.000025
0.000041
0.002607


40
78
2959041
0.000026
0.000036
0.002545


40
79
2959041
0.000025
0.000042
0.002576


40
80
2959041
0.000032
0.000040
0.002576


40
81
2959041
0.000029
0.000040
0.002576


40
82
2959041
0.000028
0.000042
0.002607


40
83
2959041
0.000029
0.000041
0.002545


40
84
2959041
0.000029
0.000042
0.002576


40
85
2959041
0.000028
0.000041
0.002545


40
86
2959041
0.000030
0.000041
0.002576


40
87
2959041
0.000033
0.000042
0.002576


40
88
2959041
0.000028
0.000039
0.002576


40
89
2959041
0.000029
0.000040
0.002576


40
90
2959041
0.000031
0.000041
0.002545


40
91
2959041
0.000027
0.000042
0.002576


40
92
2959041
0.000027
0.000039
0.002576


40
93
2959041
0.000027
0.000039
0.002514


40
94
2959041
0.000026
0.000038
0.002545


40
95
2959041
0.000030
0.000041
0.002638


40
96
2959041
0.000030
0.000043
0.002576


40
97
2959041
0.000032
0.000042
0.002482


40
98
2959041
0.000029
0.000040
0.002482


40
99
2959041
0.000027
0.000040
0.002576


40
100
2959041
0.000030
0.000040
0.002545


40
101
2959041
0.000028
0.000042
0.002545


40
102
2959041
0.000027
0.000042
0.002576


40
103
2959041
0.000027
0.000039
0.002576


40
104
2959041
0.000029
0.000039
0.002545


40
105
2959041
0.000030
0.000040
0.002576


40
106
2959041
0.000028
0.000042
0.002514


40
107
2959041
0.000028
0.000041
0.002576


40
108
2959041
0.000028
0.000041
0.002545


40
109
2959041
0.000024
0.000038
0.002545


40
110
2959041
0.000029
0.000038
0.002576


40
111
2959041
0.000031
0.000042
0.002576


40
112
2959041
0.000030
0.000040
0.002576


40
113
2959041
0.000030
0.000042
0.002576


40
114
2959041
0.000029
0.000037
0.002545


40
115
2959041
0.000029
0.000042
0.002576


40
116
2959041
0.000030
0.000040
0.002545


40
117
2959041
0.000028
0.000040
0.002545


40
118
2959041
0.000026
0.000038
0.002576


40
119
2959041
0.000027
0.000042
0.002576


40
120
2959041
0.000026
0.000042
0.002576


40
121
2959041
0.000028
0.000041
0.002514


40
122
2959041
0.000026
0.000042
0.002545


40
123
2959041
0.000029
0.000042
0.002576


40
124
2959041
0.000028
0.000040
0.002576


40
125
2959041
0.000029
0.000043
0.002576


40
126
2959041
0.000030
0.000045
0.002576


40
127
2959041
0.000028
0.000041
0.002545


40
128
2959041
0.000031
0.000038
0.002545


40
129
2959041
0.000030
0.000041
0.002576


40
130
2959041
0.000030
0.000042
0.002576


40
131
2959041
0.000030
0.000041
0.002545


40
132
2959041
0.000027
0.000040
0.002576


40
133
2959041
0.000030
0.000039
0.002576


40
134
2959041
0.000028
0.000040
0.002514


40
135
2959041
0.000028
0.000041
0.002482


40
136
2959041
0.000033
0.000040
0.002514


40
137
2959041
0.000028
0.000043
0.002576


40
138
2959041
0.000028
0.000042
0.002514


40
139
2959041
0.000028
0.000039
0.002576


40
140
2959041
0.000023
0.000041
0.002638


40
141
2959041
0.000030
0.000042
0.002545


40
142
2959041
0.000027
0.000042
0.002576


40
143
2959041
0.000027
0.000042
0.002576


40
144
2959041
0.000032
0.000042
0.002514


40
145
2959041
0.000029
0.000040
0.002576


40
146
2959041
0.000029
0.000041
0.002576


40
147
2959041
0.000031
0.000043
0.002514


40
148
2959041
0.000021
0.000041
0.002514


40
149
2959041
0.000029
0.000040
0.002576


40
150
2959041
0.000029
0.000042
0.002576


40
151
2959041
0.000029
0.000040
0.002576


40
152
2959041
0.000029
0.000042
0.002576


40
153
2959041
0.000027
0.000043
0.002607


40
154
2959041
0.000029
0.000040
0.002576


40
155
2959041
0.000028
0.000040
0.002576


40
156
2959041
0.000031
0.000043
0.002607


40
157
2959041
0.000028
0.000040
0.002545


40
158
2959041
0.000029
0.000042
0.002576


40
159
2959041
0.000029
0.000043
0.002576


40
160
2959041
0.000030
0.000039
0.002545


40
161
2959041
0.000026
0.000042
0.002576


40
162
2959041
0.000032
0.000042
0.002545


40
163
2959041
0.000029
0.000042
0.002607


40
164
2959041
0.000032
0.000041
0.002514


40
165
2959041
0.000026
0.000038
0.002576


40
166
2959041
0.000029
0.000042
0.002545


40
167
2959041
0.000029
0.000041
0.002607


40
168
2959041
0.000028
0.000041
0.002545


40
169
2959041
0.000027
0.000041
0.002545


40
170
2959041
0.000030
0.000039
0.002576


40
171
2959041
0.000028
0.000039
0.002576


40
172
2959041
0.000028
0.000042
0.002576


40
173
2959041
0.000033
0.000042
0.002607


40
174
2959041
0.000029
0.000041
0.002545


40
175
2959041
0.000030
0.000045
0.002545


40
176
2959041
0.000030
0.000041
0.002545


40
177
2959041
0.000029
0.000040
0.002576


40
178
2959041
0.000027
0.000038
0.002607


40
179
2959041
0.000027
0.000038
0.002545


40
180
2959041
0.000030
0.000045
0.002545


40
181
2959041
0.000025
0.000041
0.002545


40
182
2959041
0.000024
0.000039
0.002451


40
183
2959041
0.000028
0.000041
0.002545


40
184
2959041
0.000027
0.000041
0.002545


40
185
2959041
0.000028
0.000040
0.002576


40
186
2959041
0.000028
0.000042
0.002576


40
187
2959041
0.000027
0.000036
0.002514


40
188
2959041
0.000027
0.000042
0.002576


40
189
2959041
0.000028
0.000041
0.002545


40
190
2959041
0.000031
0.000040
0.002576


40
191
2959041
0.000029
0.000040
0.002576


40
192
2959041
0.000026
0.000041
0.002545


40
193
2959041
0.000029
0.000040
0.002576


40
194
2959041
0.000027
0.000038
0.002576


40
195
2959041
0.000031
0.000042
0.002576


40
196
2959041
0.000027
0.000040
0.002576


40
197
2959041
0.000031
0.000040
0.002545


40
198
2959041
0.000029
0.000037
0.002545


40
199
2959041
0.000027
0.000040
0.002576


40
200
2959041
0.000027
0.000040
0.002514


40
201
2959041
0.000027
0.000041
0.002607


40
202
2959041
0.000030
0.000037
0.002576


40
203
2959041
0.000031
0.000040
0.002576


40
204
2959041
0.000028
0.000040
0.002545


40
205
2959041
0.000027
0.000042
0.002576


40
206
2959041
0.000028
0.000040
0.002545


40
207
2959041
0.000028
0.000042
0.002576


40
208
2959041
0.000029
0.000042
0.002576


40
209
2959041
0.000029
0.000039
0.002545


40
210
2959041
0.000027
0.000040
0.002545


40
211
2959041
0.000027
0.000040
0.002545


40
212
2959041
0.000032
0.000042
0.002545


40
213
2959041
0.000029
0.000040
0.002576


40
214
2959041
0.000027
0.000041
0.002545


40
215
2959041
0.000029
0.000040
0.002576


40
216
2959041
0.000030
0.000045
0.002545


40
217
2959041
0.000033
0.000041
0.002576


40
218
2959041
0.000030
0.000043
0.002638


40
219
2959041
0.000025
0.000046
0.002545


40
220
2959041
0.000028
0.000042
0.002576


40
221
2959041
0.000030
0.000043
0.002545


40
222
2959041
0.000033
0.000042
0.002607


40
223
2959041
0.000031
0.000042
0.002482


40
224
2959041
0.000027
0.000040
0.002545


40
225
2959041
0.000031
0.000042
0.002545


40
226
2959041
0.000028
0.000040
0.002576


40
227
2959041
0.000028
0.000041
0.002576


40
228
2959041
0.000027
0.000041
0.002545


40
229
2959041
0.000030
0.000039
0.002545


40
230
2959041
0.000030
0.000044
0.002545


40
231
2959041
0.000028
0.000041
0.002576


40
232
2959041
0.000033
0.000038
0.002545


40
233
2959041
0.000025
0.000040
0.002545


40
234
2959041
0.000027
0.000037
0.002576


40
235
2959041
0.000030
0.000041
0.002576


40
236
2959041
0.000027
0.000042
0.002514


40
237
2959041
0.000027
0.000039
0.002545


40
238
2959041
0.000030
0.000043
0.002638


40
239
2959041
0.000026
0.000038
0.002545


40
240
2959041
0.000028
0.000041
0.002545


40
241
2959041
0.000030
0.000040
0.002545


40
242
2959041
0.000028
0.000040
0.002545


40
243
2959041
0.000028
0.000042
0.002545


40
244
2959041
0.000027
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0.002576


40
245
2959041
0.000032
0.000040
0.002576


40
246
2959041
0.000028
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0.002545


40
247
2959041
0.000028
0.000042
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40
248
2959041
0.000028
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40
249
2959041
0.000028
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40
250
2959041
0.000027
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40
251
2959041
0.000027
0.000040
0.002545


40
252
2959041
0.000028
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0.002545


40
253
2959041
0.000026
0.000040
0.003945


40
254
2959041
0.000028
0.000039
0.004039


40
255
2959041
0.000025
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0
2959046
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1
2959046
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41
2
2959046
0.000029
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41
3
2959046
0.000029
0.000042
0.003945


41
4
2959046
0.000028
0.000040
0.003945


41
5
2959046
0.000026
0.000041
0.003977


41
6
2959046
0.000026
0.000043
0.003977


41
7
2959046
0.000027
0.000039
0.003977


41
8
2959046
0.000027
0.000043
0.003977


41
9
2959046
0.000032
0.000042
0.003945


41
10
2959046
0.000026
0.000039
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41
11
2959046
0.000029
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41
12
2959046
0.000031
0.000040
0.004008


41
13
2959046
0.000028
0.000041
0.003977


41
14
2959046
0.000028
0.000039
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41
15
2959046
0.000027
0.000040
0.003977


41
16
2959046
0.000030
0.000041
0.003977


41
17
2959046
0.000029
0.000038
0.003977


41
18
2959046
0.000025
0.000041
0.003977


41
19
2959046
0.000031
0.000042
0.004008


41
20
2959046
0.000027
0.000039
0.003977


41
21
2959046
0.000031
0.000040
0.003977


41
22
2959046
0.000030
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0.003914


41
23
2959046
0.000026
0.000037
0.003977


41
24
2959046
0.000028
0.000040
0.004008


41
25
2959046
0.000029
0.000042
0.003977


41
26
2959046
0.000031
0.000038
0.003977


41
27
2959046
0.000028
0.000041
0.003977


41
28
2959046
0.000029
0.000042
0.004008


41
29
2959046
0.000028
0.000038
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41
30
2959046
0.000027
0.000042
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41
31
2959046
0.000027
0.000042
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41
32
2959046
0.000029
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41
33
2959046
0.000028
0.000042
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41
34
2959046
0.000026
0.000043
0.003977


41
35
2959046
0.000029
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41
36
2959046
0.000031
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41
37
2959046
0.000027
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41
38
2959046
0.000028
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41
39
2959046
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41
40
2959046
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41
41
2959046
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41
42
2959046
0.000028
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41
43
2959046
0.000031
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41
44
2959046
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41
45
2959046
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41
46
2959046
0.000028
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41
47
2959046
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41
48
2959046
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41
49
2959046
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41
50
2959046
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41
51
2959046
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41
52
2959046
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41
53
2959046
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41
54
2959046
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41
55
2959046
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41
56
2959046
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41
57
2959046
0.000029
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41
58
2959046
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41
59
2959046
0.000029
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41
60
2959046
0.000029
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41
61
2959046
0.000031
0.000042
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41
62
2959046
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41
63
2959046
0.000027
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41
64
2959046
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41
65
2959046
0.000028
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41
66
2959046
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67
2959046
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68
2959046
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69
2959046
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41
70
2959046
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41
71
2959046
0.000027
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2959046
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41
73
2959046
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2959046
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2959046
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2959046
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2959046
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2959046
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2959046
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80
2959046
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41
81
2959046
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2959046
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41
83
2959046
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41
84
2959046
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85
2959046
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86
2959046
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41
87
2959046
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41
88
2959046
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41
89
2959046
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41
90
2959046
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41
91
2959046
0.000028
0.000038
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41
92
2959046
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41
93
2959046
0.000027
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41
94
2959046
0.000028
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41
95
2959046
0.000029
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41
96
2959046
0.000025
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41
97
2959046
0.000030
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41
98
2959046
0.000027
0.000040
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41
99
2959046
0.000028
0.000042
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41
100
2959046
0.000028
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41
101
2959046
0.000027
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41
102
2959046
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41
103
2959046
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41
104
2959046
0.000028
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41
105
2959046
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106
2959046
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41
107
2959046
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41
108
2959046
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41
109
2959046
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41
110
2959046
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41
111
2959046
0.000028
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41
112
2959046
0.000029
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41
113
2959046
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41
114
2959046
0.000029
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41
115
2959046
0.000029
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41
116
2959046
0.000027
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41
117
2959046
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118
2959046
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119
2959046
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41
120
2959046
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121
2959046
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41
122
2959046
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41
123
2959046
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41
124
2959046
0.000032
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41
125
2959046
0.000031
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41
126
2959046
0.000031
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41
127
2959046
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41
128
2959046
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41
129
2959046
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41
130
2959046
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41
131
2959046
0.000027
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41
132
2959046
0.000029
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41
133
2959046
0.000031
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41
134
2959046
0.000031
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41
135
2959046
0.000025
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41
136
2959046
0.000028
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41
137
2959046
0.000029
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41
138
2959046
0.000026
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41
139
2959046
0.000029
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41
140
2959046
0.000027
0.000042
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41
141
2959046
0.000027
0.000038
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41
142
2959046
0.000031
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41
143
2959046
0.000028
0.000045
0.004008


41
144
2959046
0.000028
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41
145
2959046
0.000029
0.000041
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41
146
2959046
0.000028
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41
147
2959046
0.000031
0.000041
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41
148
2959046
0.000029
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41
149
2959046
0.000029
0.000040
0.004008


41
150
2959046
0.000029
0.000039
0.003945


41
151
2959046
0.000025
0.000041
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41
152
2959046
0.000031
0.000044
0.003977


41
153
2959046
0.000027
0.000040
0.003945


41
154
2959046
0.000029
0.000041
0.003945


41
155
2959046
0.000029
0.000038
0.003914


41
156
2959046
0.000029
0.000042
0.004008


41
157
2959046
0.000027
0.000037
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41
158
2959046
0.000027
0.000039
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41
159
2959046
0.000028
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41
160
2959046
0.000030
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41
161
2959046
0.000033
0.000040
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41
162
2959046
0.000028
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41
163
2959046
0.000029
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41
164
2959046
0.000027
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41
165
2959046
0.000025
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41
166
2959046
0.000029
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41
167
2959046
0.000026
0.000041
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41
168
2959046
0.000030
0.000041
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41
169
2959046
0.000027
0.000041
0.003945


41
170
2959046
0.000028
0.000042
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41
171
2959046
0.000028
0.000040
0.003977


41
172
2959046
0.000031
0.000038
0.003977


41
173
2959046
0.000027
0.000040
0.004039


41
174
2959046
0.000026
0.000038
0.003977


41
175
2959046
0.000028
0.000040
0.004008


41
176
2959046
0.000028
0.000041
0.003977


41
177
2959046
0.000032
0.000040
0.003977


41
178
2959046
0.000028
0.000042
0.004008


41
179
2959046
0.000029
0.000042
0.003977


41
180
2959046
0.000029
0.000042
0.003977


41
181
2959046
0.000028
0.000040
0.003945


41
182
2959046
0.000030
0.000040
0.003977


41
183
2959046
0.000028
0.000040
0.003977


41
184
2959046
0.000023
0.000041
0.003914


41
185
2959046
0.000033
0.000043
0.003914


41
186
2959046
0.000030
0.000041
0.003977


41
187
2959046
0.000027
0.000042
0.003914


41
188
2959046
0.000027
0.000042
0.003977


41
189
2959046
0.000030
0.000042
0.003977


41
190
2959046
0.000029
0.000042
0.004008


41
191
2959046
0.000028
0.000042
0.003977


41
192
2959046
0.000031
0.000041
0.003977


41
193
2959046
0.000033
0.000042
0.003977


41
194
2959046
0.000028
0.000041
0.003945


41
195
2959046
0.000026
0.000039
0.003977


41
196
2959046
0.000031
0.000040
0.003977


41
197
2959046
0.000030
0.000042
0.003977


41
198
2959046
0.000030
0.000039
0.003977


41
199
2959046
0.000029
0.000040
0.003977


41
200
2959046
0.000031
0.000040
0.003977


41
201
2959046
0.000032
0.000040
0.004008


41
202
2959046
0.000027
0.000040
0.003977


41
203
2959046
0.000026
0.000040
0.003977


41
204
2959046
0.000030
0.000040
0.003977


41
205
2959046
0.000032
0.000041
0.004008


41
206
2959046
0.000026
0.000039
0.003977


41
207
2959046
0.000031
0.000040
0.003977


41
208
2959046
0.000031
0.000040
0.003977


41
209
2959046
0.000027
0.000041
0.003977


41
210
2959046
0.000031
0.000041
0.003945


41
211
2959046
0.000032
0.000040
0.003914


41
212
2959046
0.000030
0.000042
0.003914


41
213
2959046
0.000028
0.000038
0.003977


41
214
2959046
0.000029
0.000043
0.003977


41
215
2959046
0.000030
0.000040
0.003977


41
216
2959046
0.000029
0.000040
0.003883


41
217
2959046
0.000027
0.000041
0.003977


41
218
2959046
0.000028
0.000040
0.003977


41
219
2959046
0.000030
0.000042
0.003977


41
220
2959046
0.000029
0.000040
0.003977


41
221
2959046
0.000028
0.000040
0.004008


41
222
2959046
0.000027
0.000043
0.003945


41
223
2959046
0.000029
0.000040
0.003977


41
224
2959046
0.000029
0.000041
0.003977


41
225
2959046
0.000028
0.000034
0.003977


41
226
2959046
0.000029
0.000041
0.003977


41
227
2959046
0.000030
0.000042
0.003977


41
228
2959046
0.000028
0.000043
0.003977


41
229
2959046
0.000028
0.000040
0.004039


41
230
2959046
0.000025
0.000043
0.004039


41
231
2959046
0.000026
0.000045
0.003977


41
232
2959046
0.000027
0.000040
0.003977


41
233
2959046
0.000028
0.000041
0.003945


41
234
2959046
0.000028
0.000039
0.003977


41
235
2959046
0.000028
0.000044
0.004039


41
236
2959046
0.000026
0.000043
0.003977


41
237
2959046
0.000027
0.000040
0.004008


41
238
2959046
0.000029
0.000038
0.003945


41
239
2959046
0.000033
0.000042
0.003977


41
240
2959046
0.000029
0.000040
0.003977


41
241
2959046
0.000029
0.000041
0.003977


41
242
2959046
0.000030
0.000040
0.003945


41
243
2959046
0.000026
0.000038
0.003945


41
244
2959046
0.000023
0.000042
0.003945


41
245
2959046
0.000028
0.000039
0.003977


41
246
2959046
0.000028
0.000039
0.003977


41
247
2959046
0.000025
0.000042
0.003977


41
248
2959046
0.000029
0.000041
0.003977


41
249
2959046
0.000027
0.000039
0.003945


41
250
2959046
0.000030
0.000040
0.003977


41
251
2959046
0.000027
0.000042
0.003977


41
252
2959046
0.000029
0.000043
0.003977


41
253
2959046
0.000031
0.000038
0.027105


41
254
2959046
0.000030
0.000039
0.027167


41
255
2959046
0.000031
0.000040
0.027229









The invention provides a method 200 for using the stimulations and responses of a known good device to increase the fault coverage of the patterns in the test flow. The method 200 includes a number of individual steps, as illustrated in FIG. 2.
The method 200 preferably begins with step 202, which is to pause on the pattern of interest in the test program flow.
Step 204 of the method 200 is to provide an appropriate computer program.
Step 206 of the method 200 is to have the appropriate computer program query the user regarding the start vector address.
Step 208 of the method 200 is to have the appropriate computer program query the user regarding the first inspect vector address.
Step 210 of the method 200 is to have the appropriate computer program query the user regarding the last inspect vector address, thus defining an inspect vector range between the first and last inspect vector addresses.
Step 212 of the method 200 is to have the appropriate computer program query the user regarding consecutive passes for new vectors.
Step 214 of the method 200 is to have the appropriate computer program query the user regarding data logging requirements.
Step 216 of the method 200 is to have the appropriate computer program query the user regarding file name for output storage.
Step 218 of the method 200 is to have the appropriate computer program start processing the pattern vectors in the inspect vector range. The appropriate computer program characterizes each of the signals on the current inspect vector with “X” or “don't care” characters to determine whether an output signal is actually being driven. If the output signal is being driven, the appropriate computer program will change the “X” or “don't care” character to the appropriate high “H” or low “L” strobe character, depending on whether the signal is actually an output that is being driven to a high or low state. Once the appropriate computer program has completed changing an entire vector, it will run the pattern with the new vector for the consecutive passes required by the user. This will be done at both minimum and maximum normal operating voltage (VDD) device power settings to insure the new vector is not marginal. The “X” or “don't care” characters are typically signal output characters that are not strobed and, therefore, they do not add to the fault coverage of the test.
Step 220 of the method 200 is to reset the new “H” or “L” strobe characters back to their original “X” or “don't care” characters if any of the new “H” or “L” strobe characters fail during consecutive passes at the minimum and maximum VDD power settings and then retesting. Step 220 will continue until the new vector passes the required number of consecutive passes.
Step 222 of the method 200 is to process the next inspect vector by repeating steps 218 and 220 as necessary. The method 200 will continue until all of the vectors in the inspect vector range have been processed. The results will be saved to the file specified by the user and the pattern file containing the new vectors may be saved in the appropriate computer program for future use.
Thus, the method 200 uses the appropriate computer program to use the stimulations and responses of a know good device to increase the fault coverage of the patterns in the test flow. The appropriate computer program does this by changing the patterns to include additional strobes in the pattern vectors that could not be determined during simulations.
The method 200 has a number of advantages, including, the fact that it resides within the test program and can be invoked easily and that it can automatically characterize the outputs of a device to increase the fault coverage of the test program without the disadvantages of re-design and re-simulation.
Table 5 provides an example run of the appropriate computer program using the method 200.









TABLE 5







Enter
{circumflex over ( )}A <advance>
to start



{circumflex over ( )}F <finish>
to stop



{circumflex over ( )}P
to pause







begin> pause fct


begin> data fct


begin>









STDF Version 4 has been enabled







STDF collection file ‘/home3/STDF/coll_UNSPECIFIED.std’ is opened.


chmod: /home3/STDF/coll_UNSPECIFIED.std: Not owner








BLK_B1_FUNC_MIN
235520 to 315127 pass







break> faq <—--User is paused on the pattern of interest in invokes FAQuest


For options 1 and 2 you must already be paused on the


pattern of interest


For option 3 you must be paused on the functional


continuity test.


If you are not paused as required, choose option 4


to exit this menu to get to the required pause


location.


In addition, options 1 and 3 use a user defined pinlist


RMA that is initially set to ALLPIN. You can update


the RMA pinlist by using the interactive pinl command


prior to using options 1 and 3 of this routine.


Note: In many menus if you enter a -l it will return


you to the test program flow.


Enter a 1 for ATESignature scan analysis.


Enter a 2 for ATEPattern changing analysis.


Enter a 3 for ATECurve tracing analysis.


Enter a 4 to return to the program.


Enter your selection: 2 <—-- User select the ATEPattern changing analysis option.









Enter the pattern start address: 235520 <—-- User input.



You should make sure the first vector to inspect



does not include the initialization vectors. An



inspection of the pattern file will usually show



where the initialization vectors end. However a



safe assumption is to skip the first 100 vectors



of information. If you get a functional burst



fail after the change you likely need to skip



additional vectors.










Enter the first vector address to inspect:
235620 <—-- User input.










Enter the last vector address to inspect:
235640 <—-- User input.










Consequtive passes required for new vectors (default 1):
2 <—-- User input.







Enter the number that corresponds to your data


logging requirements of the vector anaylsis.


Enter a 1 for no vector data logging analysis.


Enter a 2 for on screen data logging analysis.


Enter a 3 for open a file for data logging.


Enter a 4 for both.








Enter the data logging switch option:
4 <—-- User input.







Do not make the file name the same as the program name.


Enter a file name: example_run.txt <—-- User input.


The file example_run.txt has been opened.


Skip Processing of a Non-Inspect Vector 235520


Skip Processing of a Non-Inspect Vector 235521


Skip Processing of a Non-Inspect Vector 235522


Skip Processing of a Non-Inspect Vector 235523


Skip Processing of a Non-Inspect Vector 235524


Skip Processing of a Non-Inspect Vector 235525


Skip Processing of a Non-Inspect Vector 235526


Skip Processing of a Non-Inspect Vector 235527


Skip Processing of a Non-Inspect Vector 235528


Skip Processing of a Non-Inspect Vector 235529


Skip Processing of a Non-Inspect Vector 235530


Skip Processing of a Non-Inspect Vector 235531


Skip Processing of a Non-Inspect Vector 235532


Skip Processing of a Non-Inspect Vector 235533


Skip Processing of a Non-Inspect Vector 235534


Skip Processing of a Non-Inspect Vector 235535


Skip Processing of a Non-Inspect Vector 235536


Skip Processing of a Non-Inspect Vector 235537


Skip Processing of a Non-Inspect Vector 235538


Skip Processing of a Non-Inspect Vector 235539


Skip Processing of a Non-Inspect Vector 235540


Skip Processing of a Non-Inspect Vector 235541


Skip Processing of a Non-Inspect Vector 235542


Skip Processing of a Non-Inspect Vector 235543


Skip Processing of a Non-Inspect Vector 235544


Skip Processing of a Non-Inspect Vector 235545


Skip Processing of a Non-Inspect Vector 235546


Skip Processing of a Non-Inspect Vector 235547


Skip Processing of a Non-Inspect Vector 235548


Skip Processing of a Non-Inspect Vector 235549


Skip Processing of a Non-Inspect Vector 235550


Skip Processing of a Non-Inspect Vector 235551


Skip Processing of a Non-Inspect Vector 235552


Skip Processing of a Non-Inspect Vector 235553


Skip Processing of a Non-Inspect Vector 235554


Skip Processing of a Non-Inspect Vector 235555


Skip Processing of a Non-Inspect Vector 235556


Skip Processing of a Non-Inspect Vector 235557


Skip Processing of a Non-Inspect Vector 235558


Skip Processing of a Non-Inspect Vector 235559


Skip Processing of a Non-Inspect Vector 235560


Skip Processing of a Non-Inspect Vector 235561


Skip Processing of a Non-Inspect Vector 235562


Skip Processing of a Non-Inspect Vector 235563


Skip Processing of a Non-Inspect Vector 235564


Skip Processing of a Non-Inspect Vector 235565


Skip Processing of a Non-Inspect Vector 235566


Skip Processing of a Non-Inspect Vector 235567


Skip Processing of a Non-Inspect Vector 235568


Skip Processing of a Non-Inspect Vector 235569


Skip Processing of a Non-Inspect Vector 235570


Skip Processing of a Non-Inspect Vector 235571


Skip Processing of a Non-Inspect Vector 235572


Skip Processing of a Non-Inspect Vector 235573


Skip Processing of a Non-Inspect Vector 235574


Skip Processing of a Non-Inspect Vector 235575


Skip Processing of a Non-Inspect Vector 235576


Skip Processing of a Non-Inspect Vector 235577


Skip Processing of a Non-Inspect Vector 235578


Skip Processing of a Non-Inspect Vector 235579


Skip Processing of a Non-Inspect Vector 235580


Skip Processing of a Non-Inspect Vector 235581


Skip Processing of a Non-Inspect Vector 235582


Skip Processing of a Non-Inspect Vector 235583


Skip Processing of a Non-Inspect Vector 235584


Skip Processing of a Non-Inspect Vector 235585


Skip Processing of a Non-Inspect Vector 235586


Skip Processing of a Non-Inspect Vector 235587


Skip Processing of a Non-Inspect Vector 235588


Skip Processing of a Non-Inspect Vector 235589


Skip Processing of a Non-Inspect Vector 235590


Skip Processing of a Non-Inspect Vector 235591


Skip Processing of a Non-Inspect Vector 235592


Skip Processing of a Non-Inspect Vector 235593


Skip Processing of a Non-Inspect Vector 235594


Skip Processing of a Non-Inspect Vector 235595


Skip Processing of a Non-Inspect Vector 235596


Skip Processing of a Non-Inspect Vector 235597


Skip Processing of a Non-Inspect Vector 235598


Skip Processing of a Non-Inspect Vector 235599


Skip Processing of a Non-Inspect Vector 235600


Skip Processing of a Non-Inspect Vector 235601


Skip Processing of a Non-Inspect Vector 235602


Skip Processing of a Non-Inspect Vector 235603


Skip Processing of a Non-Inspect Vector 235604


Skip Processing of a Non-Inspect Vector 235605


Skip Processing of a Non-Inspect Vector 235606


Skip Processing of a Non-Inspect Vector 235607


Skip Processing of a Non-Inspect Vector 235608


Skip Processing of a Non-Inspect Vector 235609


Skip Processing of a Non-Inspect Vector 235610


Skip Processing of a Non-Inspect Vector 235611


Skip Processing of a Non-Inspect Vector 235612


Skip Processing of a Non-Inspect Vector 235613


Skip Processing of a Non-Inspect Vector 235614


Skip Processing of a Non-Inspect Vector 235615


Skip Processing of a Non-Inspect Vector 235616


Skip Processing of a Non-Inspect Vector 235617


Skip Processing of a Non-Inspect Vector 235618


Skip Processing of a Non-Inspect Vector 235619


Processing Inspect Vector 235620 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get data log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235621 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235622 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get data log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235623 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235624 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235625 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235626 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235627 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235628 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235629 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235630 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235631 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235632 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235633 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235634 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235635 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235636 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235637 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235638 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235639 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Processing Inspect Vector 235640 of 235640








BLK_B1_FUNC_MIN
235520 to 235640 pass


First status ficm read = 0


First status ficm read = 0


Changed an X to an H.


First status ficm write = 0


Xs changed to Ls = 0


Xs changed to Hs = 1


Power supplies set to minimum.







Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Power supplies set to maximum


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


Consequtive get_data_log result, the Ls and Hs have been written


Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0


These counts only relate to the pins included in your pinlist.


Beginning Vector X Count = 75


Vector Xs changed to Ls = 0


Vector Xs changed to Hs = 1


Vector Xs unchanged = 74


Pattern Summary









Total Pattern Xs Considered =
1575



Total Pattern Xs Remaining =
1554


Total Xs changed to Ls =
  0


Total Xs changed to Hs =
 21


Total Xs changed =
 21 —————
This summary shows that the pattern


break>

fault coverage has been increased by




changing the “X” or “don't care”




strobe to output “H” strobes.









The invention further provides a method 300 to curve trace device buffers on an ATE. The method 300 includes a number of individual steps, as illustrated in FIG. 3.
The method 300 begins with step 302, which is to define a predetermined pin list. The predetermined pin list is set to include all of the pins used during the pattern loads.
Step 304 of the method 300 is to modify the predetermined pin list using a predetermined debugger command in order to include desired pins for characterization using an appropriate computer program.
Step 306 of the method 300 is to have the appropriate computer program query the user regarding the filename where data will be stored.
Step 308 of the method 300 is to have the appropriate computer program query the user as to whether the UNIX GNUPLOT utility will be used.
Step 310 of the method 300 is to read one of the pins from the predetermined pin list.
Step 312 of the method 300 is to use pin measurement units to force incrementally increasing voltage from zero (0) volts to a predefined maximum current limit is reached, for example, to a maximum of one (1) volt or until −100 μA of current limit is reached.
Step 314 of the method 300 is to flag any problem pins identified in step 312 and to store the values at each increment to the data files.
Step 316 of the method 300 is to use pin measurement units to force incrementally decreasing voltage from zero (0) volts to a predefined minimum current limit is reached, for example, to a minimum of negative one (−1) volt or until +100 μA of current limit is reached.
Step 318 of the method 300 is to flag any problem pins identified in step 316 and to store the values at each increment to the data files.
Step 320 of the method 300 is to determine if all of the pins in the predetermined pin list have been evaluated. If all of the pins in the predetermined pin list have been evaluated, the method 300 is finished. If, however, all of the pins in the predetermined pin list have not been evaluated, then the method 300 continues by returning to step 310 of the method 300 and then executing steps 310, 312, 314, 316, 318, 320 as appropriate.
It should be noted that all test limits and increments are programmable.
The data can be stored in three different files, the names of which are specified by the user, except where noted. The first file contains the pin name(s) and their associated data, such as voltage and current. The first file is stored in a space separated text format readable by offline analysis software, such as MathCAD or Microsoft EXCEL. The second file contains the individual pin data that are used by the standard UNIX 2D graphing utility “gnuplot”. These files are automatically named with the pin name for the data it contains. The third file is a standard command file that the UNIX gnuplot utility can read to display the 2D graphs automatically.
Thus, the method 300 provides the user with the availability to curve trace device buffers on an ATE. The method 300 has the advantage of providing buffer curve tracing and characterizing during an ATE test session. The method 300 also has the advantage of not requiring the user to need to utilize offline curve tracing equipment. The method 300 further has the advantage of allowing the user the ability to view digitized data and abnormalities not detected with go-no-go tests.
The method 300 could alternatively be used to collect data used in the analysis of package development and the analysis of new fabrication technologies.
Step 312 of method 100 could alternatively use pin measurement units to force or sink incremental currents and measure voltage to characterize the device pins.
Tables 6–9 provide examples from using the method 300. Table 6 provides an example run of the appropriate computer program using the method 300. Table 7 provides an example of the files created by the method 300. Table 8 provides plot examples using the UNIX “gnuplot” utility and Microsoft EXCEL. Table 9 provides an example of the ability of the appropriate computer program to identify problems missed by a typical production test program.







TABLE 6







The following information was extracted from and actual test section and shows how


ATECurve is executed.


begin> pause fct


begin>


STDF Version 4 has been enabled


STDF collection file ‘/home3/STDF/coll_UNSPECIFIED.std’ is opened.


chmod: /home3/STDF/coll_UNSPECIFIED.std: Not owner


Pause in “BLK_OS_FUN_CON” due to functional fail


func_test(func_pins = ALLPIN, start_vec = 8 , stop_vec = 290)


This section of the test flow shows that the RMA pin list is initially set to all pins


used on the device.


break> pinl rma








RMA   :
D279_SCSIR(1), D269_SCSII(2), D278_SCSIM(3), D266_SCSID(4),



D270_SCSII(5), D276_SCSIS(6), D273_SCSIC(7), D275_SCSIS(8),



D277_SCSIM(10), D288_SCSIA(11), D274_SCSIC(12), D280_SCSIR(13),



D286_SCSIB(14), D285_SCSIB(16), D295_SCSID(17), D282_SCSIA(18),



D296_SCSID(19), D281_SCSIA(20), D294_SCSID(21), D287_SCSIA(23),



D291_SCSIP(24), D299_SCSID(25), D292_SCSIP(26), D300_SCSID(27),



D293_SCSID(28), D301_SCSID(29), D297_SCSID(31), D298_SCSID(32),



D308_SCSID(33), D302_SCSID(34), D307_SCSID(35), D303_SCSID(36),



D309_SCSIP(37), D305_SCSID(38), D306_SCSID(39), D304_SCSID(40),



D316_SCSID(41), D312_SCSID(42), D313_SCSID(43), D314_SCSID(44),



D322_SCANM(45), D310_SCSIP(46), D319_TM(47), D311_SCSID(48),



D317_SCSID(51), D326_PIPES(52), D328_TRACE(53), D315_SCSID(54),



D325_PIPES(55), D323_TN(56), D001_TRACE(63), D076_TMSIC(65),



D063_SCSIP(66), D073_IDDTN(67), D064_SCSIP(68), D067_SCSID(69),



D062_SCSID(70), D066_SCSID(71), D065_SCSID(72), D142_PCIAD(89),



D133_NPCIT(90), D145_PCIAD(91), D125_PCIAD(92), D136_NPCIP(93),



D144_PCIAD(94), D140_PCIAD(95), D137_NPCIS(96), D216_GPIO_(97),



D166_GPIO_(98), D226_NFLAS(99), D165_GPIO_(100), D214_GPIO_(102),



D225_NFLAS(103), D215_GPIO_(104), D240_MAD_0(105),



D234_MAD_5(106), D244_MAD_9(107), D230_NRAMW(108),



D228_NRAMO(110), D237_MAD_3(112), D074_CLKMO(121),



D068_SCSID(122), D070_SCSID(123), D069_SCSID(124),



D072_SCSID(125), D075_TCKIC(126), D071_SCSID(127),



D080_RTCKI(128), D155_PCIAD(129), D158_NPCIA(131),



D139_NPCIC(132), D148_PCIAD(133), D152_PCIAD(134),



D141_PCIAD(135), D138_PCIPA(136), D154_PCIAD(137),



D147_PCIAD(138), D150_PCIAD(139), D146_PCIAD(140),



D149_NPCIC(141), D153_PCIAD(143), D157_PCIAD(144),



D175_NPCIC(145), D151_PCIAD(146), D156_PCIAD(148),



D159_NPCIR(151), D178_PCIAD(153), D161_PCICL(154),



D173_NPCIC(158), D179_PCIAD(159), D183_PCIAD(161),



D167_CLKMO(162), D182_PCIAD(163), D172_NPCIC(164),



D174_NPCIC(165), D176_PCIPA(166), D180_PCIAD(168),



D190_PCIAD(169), D177_PCIAD(170), D186_PCIAD(171),



D181_PCIAD(172), D187_PCIAD(173), D184_PCIAD(175),



D191_PCIAD(176), D204_PCIAD(177), D185_PCIAD(178),



D196_PCIAD(179), D192_PCIAD(180), D195_PCIAD(181),



D189_PCIAD(182), D194_PCIAD(183), D193_PCIAD(184),



D203_PCIAD(185), D198_PCIAD(186), D202_PCIAD(187),



D201_PCIAD(188), D200_PCIAD(189), D197_PCIAD(190),



D199_PCIAD(191), D205_PCIAD(192), D209_PCIAD(194),



D208_PCIAD(196), D211_SPARE(198), D206_PCIAD(199),



D212_SCANE(200), D207_PCIAD(202), D219_LED1(203),



D222_GPIO_(205), D218_GPIO_(207), D221_SERIA(210),



D223_GPIO_(213), D224_LED0(214), D220_SERIA(215),



D229_NFLAS(220), D238_MAD_2(229), D232_MAD_7(231),



D260_DIFFS(233), D255_NRAMA(235), D242_LEDHB(236),



D251_MPAR_(237), D245_MAD_1(238), D248_MAD_1(239),



D252_MPAR_(240), D263_SCSID(241), D257_SPARE(242),



D256_NRAMC(243), D261_SCSID(244), D249_MAD_1(245),



D262_SCSID(246), D254_NRAMA(247), D271_SCSIR(249),



D265_SCSID(250), D272_SCSIR(251), D253_MCLK(252),



D268_SCSID(253), D264_SCSID(255), D267_SCSID(256),



D005_TRACE(257), D002_TRACE(259), D327_PIPES(260),



D006_TRACE(261), D318_SCSID(262), D004_TRACE(263),



D324_TRACE(264), D003_TRACE(265), D008_TRACE(267),



D014_DIFFS(268), D012_SCSIC(269), D016_SCSID(271),



D015_SCSID(272), D017_SCSID(274), D019_SCSID(275),



D018_SCSID(276), D021_SCSID(277), D022_SCSID(279),



D007_TRACE(280), D024_SCSII(281), D026_SCSIR(282),



D027_SCSIC(283), D025_SCSIR(284), D028_SCSIC(285),



D020_SCSID(286), D029_SCSIS(287), D023_SCSII(288),



D036_SCSIA(289), D031_SCSIM(290), D041_SCSIA(291),



D032_SCSIM(292), D033_SCSIR(293), D030_SCSIS(294),



D034_SCSIR(295), D035_SCSIA(296), D045_SCSIP(297),



D046_SCSIP(299), D038_SCSIB(300), D047_SCSID(301),



D037_SCSIB(302), D040_SCSIA(304), D050_SCSID(305),



D053_SCSID(307), D051_SCSID(308), D052_SCSID(309),



D048_SCSID(310), D049_SCSID(312), D059_SCSID(313),



D054_SCSID(314), D060_SCSID(315), D057_SCSID(316),



D061_SCSID(317), D055_SCSID(318), D058_SCSID(319),



D056_SCSID(320), D083_NDISS(321), D078_TDOIC(322),



D079_TRSTI(323), D084_TESTH(324), D093_TDI(325), D077_TDIIC(326),



D090_TCK(329), D091_TMS(330), D085_TESTA(331), D096_PVT1(333),



D088_NTEST(335), D086_M66EN(336), D099_NINTA(337), D094_TDO(338),



D101_NALTI(341), D100_NINTB(343), D106_NPCIG(346),



D103_NPCIR(347), D109_PCIAD(348), D108_PCIAD(349),



D102_NALTI(350), D119_PCIAD(353), D107_NPCIR(354),



D116_PCIAD(355), D111_PCIAD(356), D122_PCIAD(357),



D112_PCIAD(358), D114_PCIAD(359), D113_PCIAD(360),



D129_PCIAD(361), D115_PCIAD(362), D130_NPCIC(363),



D121_PCIAD(365), D117_NPCIC(366), D120_PCIAD(367),



D118_PCIID(368), D134_NPCID(369), D135_NPCIS(371),



D126_PCIAD(372), D132_NPCII(373), D131_NPCIF(374),



D128_PCIAD(376), D243_MAD_8(377), D239_MAD_1(378),



D246_MAD_1(379), D235_MAD_4(380), D250_MAD_1(381),



D233_MAD_6(382), D247_MAD_1(383), D241_NRAMW(384)







Here the user sets the RMA pin list to the pins of interest.


break> pinl rma = 191,246,337


pinlist RMA is being superseded


This section shows how the user invokes the FAQuest software using a three character


short cut. Some simple instructions are displayed through out the run and the user


provides the appropriate selections or inputs for the device under test.


break> faq  ---------- User invokes FAQuest


For options 1 and 2 you must already be paused on the


pattern of interest


For option 3 you must be paused on the functional


continuity test.


If you are not paused as required, choose option 4


to exit this menu to get to the required pause


location.


In addition, options 1 and 3 use a user defined pinlist


RMA that is initially set to ALLPIN. You can update


the RMA pinlist by using the interactive pinl command


prior to using options 1 and 3 of this routine.


Note: In many menus if you enter a −1 it will return


you to the test program flow.


Enter a 1 for ATESignature scan analysis.


Enter a 2 for ATEPattern changing analysis.


Enter a 3 for ATECurve tracing analysis.


Enter a 4 to return to the program.


Enter your selection: 3  ---------- User selects the ATECurve option.


The curve trace data will be saved to a file in


both row and column format for data manuipulation


and/or use in spreadsheet software.


Do not make the file name the same as the program name.


Enter a file name where your data will be stored:attachment2.txt  --------


          User inputs filename where data will be stored.


Remember you can update the RMA pinlist interactively


on the tester by using the pinl command. This is


a very easy process and can be used as many times


as you want in between executions of this utility.


You can also use the gnuplot utility on the tester


to plot the curve traces during your test session.


This utility will save a file for each pin in the


format that gnuplot requires; in addition it will


create a file called “ct” for easy pasting


of the plot command to the gnu_plot utility.


Will you use the gnuplot utility? [0=no, 1=yes]: 1  ---------- User option.


The file attachment2.txt has been opened.


The 3 pins that were selected are processed, and the information has been save to the


appropriate files. The files are included in Attachment 3 and the plots are included in


Attachment 4.


Pin 1 of 3 being processed: pin =  D199_PCIAD(P191)


Pin 2 of 3 being processed: pin =  D262_SCSID(P246)


Pin 3 of 3 being processed: pin =  D099_NINTA(P337)


break>
















TABLE 7







This is an example of one of the UNIX “gnuplot” utility pin (buffer) data files


created by the ATECurve program.


#Voltage D099_NINTA(P337)









−0.510
−0.000125



−0.500
−0.000097


−0.490
−0.000072


−0.480
−0.000053


−0.470
−0.000038


−0.460
−0.000028


−0.450
−0.000020


−0.440
−0.000014


−0.430
−0.000010


−0.420
−0.000007


−0.410
−0.000005


−0.400
−0.000004


−0.390
−0.000003


−0.380
−0.000002


−0.370
−0.000001


−0.360
−0.000001


−0.350
−0.000001


−0.340
−0.000000


−0.330
−0.000000


−0.320
−0.000000


−0.310
−0.000000


−0.300
−0.000000


−0.290
−0.000000


−0.280
−0.000000


−0.270
−0.000000


−0.260
−0.000000


−0.250
−0.000000


−0.240
−0.000000


−0.230
−0.000000


−0.220
−0.000000


−0.210
−0.000000


−0.200
−0.000000


−0.190
−0.000000


−0.180
−0.000000


−0.170
−0.000000


−0.160
−0.000000


−0.150
−0.000000


−0.140
−0.000000


−0.130
−0.000000


−0.120
−0.000000


−0.110
−0.000000


−0.100
−0.000000


−0.090
−0.000000


−0.080
−0.000000


−0.070
−0.000000


−0.060
−0.000000


−0.050
−0.000000


−0.040
+0.000000


−0.030
−0.000000


−0.020
+0.000000


−0.010
−0.000000


0.000
+0.000000


0.010
+0.000000


0.020
+0.000000


0.030
+0.000000


0.040
+0.000000


0.050
+0.000000


0.060
+0.000000


0.070
+0.000000


0.080
+0.000000


0.090
+0.000000


0.100
+0.000000


0.110
+0.000000


0.120
+0.000000


0.130
+0.000000


0.140
+0.000000


0.150
+0.000000


0.160
+0.000000


0.170
+0.000000


0.180
+0.000000


0.190
+0.000000


0.200
+0.000000


0.210
+0.000000


0.220
+0.000000


0.230
+0.000000


0.240
+0.000000


0.250
+0.000000


0.260
+0.000000


0.270
+0.000000


0.280
+0.000000


0.290
+0.000000


0.300
+0.000000


0.310
+0.000000


0.320
+0.000000


0.330
+0.000000


0.340
+0.000000


0.350
+0.000000


0.360
+0.000000


0.370
+0.000000


0.380
+0.000000


0.390
+0.000000


0.400
+0.000000


0.410
+0.000000


0.420
+0.000000


0.430
+0.000000


0.440
+0.000000


0.450
+0.000000


0.460
+0.000000


0.470
+0.000000


0.480
+0.000000


0.490
+0.000000


0.500
+0.000000


0.510
+0.000000


0.520
+0.000001


0.530
+0.000001


0.540
+0.000001


0.550
+0.000001


0.560
+0.000002


0.570
+0.000003


0.580
+0.000004


0.590
+0.000006


0.600
+0.000008


0.610
+0.000012


0.620
+0.000017


0.630
+0.000025


0.640
+0.000036


0.650
+0.000053


0.660
+0.000077


0.670
+0.000112







This is an example of the command file generated by ATECurve and used to invoke


the UNIX “gnuplot” utility.


set xlabel “Voltage(V)”


set ylabel “Current(A)”


plot “D199_PCIAD(P191)” with lines, “D262_SCSID(P246)” with


lines, “D099_NINTA(P337)” with lines


pause −1 “Take snapshot or return to exit”


This an example of the txt file created by ATECurve. It contains information that can be


read by other offline utilities such as MathCad and Microsoft EXCEL for further data


analysis and curve plotting. The data is first provided in row format and then the same


data is provided in column format. The user can select the format of their choice.


The data (+200.00000) is included as place holders that keep all data aligned structural


purposed. They are discarded after the data is read by the analysis tool.


Test Date: Aug 18 2004


Test Time: 08:20:26


This test is: BLK_OS_FUN_CON


Tester: QRT1


Note: This is the row formatted section however it is page wrapped. The data is actually


in rows of continues data for each pin.


Pin names followed by * may be suspect.













pinnamehere
−1.000000
−0.990000
−0.980000
−0.970000
−0.960000















−0.950000
−0.940000
−0.930000
−0.920000
−0.910000
−0.900000
−0.890000



−0.880000
−0.870000
−0.860000
−0.850000
−0.840000
−0.830000
−0.820000


−0.810000
−0.800000
−0.790000
−0.780000
−0.770000
−0.760000
−0.750000


−0.740000
−0.730000
−0.720000
−0.710000
−0.700000
−0.690000
−0.680000


−0.670000
−0.660000
−0.650000
−0.640000
−0.630000
−0.620000
−0.610000


−0.600000
−0.590000
−0.580000
−0.570000
−0.560000
−0.550000
−0.540000


−0.530000
−0.520000
−0.510000
−0.500000
−0.490000
−0.480000
−0.470000


−0.460000
−0.450000
−0.440000
−0.430000
−0.420000
−0.410000
−0.400000


−0.390000
−0.380000
−0.370000
−0.360000
−0.350000
−0.340000
−0.330000


−0.320000
−0.310000
−0.300000
−0.290000
−0.280000
−0.270000
−0.260000


−0.250000
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D099_NINTA(P337)
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This ends the section of page wrapped row formatted data and starts the column format of


the same data.


Voltage D199_PCIAD(P191) D262_SCSID(P246) D099_NINTA(P337)











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+0.000000
+0.000000
+0.000000


0.460
+0.000000
+0.000000
+0.000000


0.470
+0.000000
+0.000000
+0.000000


0.480
+0.000000
+0.000000
+0.000000


0.490
+0.000000
+0.000000
+0.000000


0.500
+0.000000
+0.000000
+0.000000


0.510
+0.000000
+0.000000
+0.000000


0.520
+0.000001
+0.000000
+0.000001


0.530
+0.000001
+0.000000
+0.000001


0.540
+0.000001
+0.000000
+0.000001


0.550
+0.000001
+0.000000
+0.000001


0.560
+0.000002
+0.000000
+0.000002


0.570
+0.000003
+0.000000
+0.000003


0.580
+0.000004
+0.000000
+0.000004


0.590
+0.000006
+0.000000
+0.000006


0.600
+0.000008
+0.000000
+0.000008


0.610
+0.000012
+0.000000
+0.000012


0.620
+0.000018
+0.000000
+0.000017


0.630
+0.000026
+0.000000
+0.000025


0.640
+0.000037
+0.000000
+0.000036


0.650
+0.000054
+0.000000
+0.000053


0.660
+0.000079
+0.000000
+0.000077


0.670
+0.000114
+0.000000
+0.000112


0.680
+200.000000
+0.000000
+200.000000


0.690
+200.000000
+0.000000
+200.000000


0.700
+200.000000
+0.000000
+200.000000


0.710
+200.000000
+0.000000
+200.000000


0.720
+200.000000
+0.000000
+200.000000


0.730
+200.000000
+0.000000
+200.000000


0.740
+200.000000
+0.000000
+200.000000


0.750
+200.000000
+0.000000
+200.000000


0.760
+200.000000
+0.000000
+200.000000


0.770
+200.000000
+0.000000
+200.000000


0.780
+200.000000
+0.000000
+200.000000


0.790
+200.000000
+0.000000
+200.000000


0.800
+200.000000
+0.000000
+200.000000


0.810
+200.000000
+0.000000
+200.000000


0.820
+200.000000
+0.000000
+200.000000


0.830
+200.000000
+0.000000
+200.000000


0.840
+200.000000
+0.000000
+200.000000


0.850
+200.000000
+0.000000
+200.000000


0.860
+200.000000
+0.000000
+200.000000


0.870
+200.000000
+0.000000
+200.000000


0.880
+200.000000
+0.000000
+200.000000


0.890
+200.000000
+0.000000
+200.000000


0.900
+200.000000
+0.000000
+200.000000


0.910
+200.000000
+0.000000
+200.000000


0.920
+200.000000
+0.000000
+200.000000


0.930
+200.000000
+0.000000
+200.000000


0.940
+200.000000
+0.000000
+200.000000


0.950
+200.000000
+0.000000
+200.000000


0.960
+200.000000
+0.000000
+200.000000


0.970
+200.000000
+0.000000
+200.000000


0.980
+200.000000
+0.000000
+200.000000


0.990
+200.000000
+0.000000
+200.000000


1.000
+200.000000
+0.000000
+200.000000



















TABLE 9





The follow sections were extracted from an actual production test program run on


a bad part and a good part. Both parts passed the opens and shorts test sections of


the continuity test. However, the bad part actually has a resistive short on pin 44


(P44). ATECurve demonstrates that there is a resistive short on the bad part and is


able to detect this problem See the charts following this data log example.







Bad part














OPEN_NEG
D187_N_ISC
P448
−2.000
−467.2mV
 1.000
365
pass


OPEN_NEG
D287_N_GNT
P31
−2.000
−547.9mV
 1.000
365
pass


OPEN_NEG
D291_IDSEL
P44
−2.000
−574.9mV
 1.000
365
pass


OPEN_NXG
D021_N_LOC
P259
−2.000
−547.9mV
 1.000
365
pass


OPEN_NEG
D285_PCICL
P25
−2.000
−547.9mV
 1.000
365
pass


. . .


SHORT
D289_PCIAD
P41
−3.000
−550.4mV
−100.0m
365
pass


SHORT
D288_PCIAD
P42
−3.000
−547.9mV
−100.0m
365
pass


SHORT
D291_IDSEL
P44
−3.000
−574.9mV
−100.0m
365
pass


SHORT
D010_N_CBE
P49
−3.000
−545.5mV
−100.0m
365
pass


SHORT
D292_PCIAD
P50
−3.000
−547.9mV
−100.0m
365
pass


. . .








BLKA_MAX
  376 to 69783   *FAIL*









LOW FAIL
=
.


HIGH FAIL
=
/


 TRISTATE FAIL
=
*


 SX:NO COMPARE
=
−










Vector
Loop
Cycle
 FAILED DUT PIN


500
0
125
.D020_N_DEV







Pause in “BLKA_MAX” due to functional fail


func_test(func_pins = OBPIN, start_vec = 376 , stop_vec = 69783)










Good part














OPEN_NEG
D187_N_ISC
P448
−2.000
−477.0mV
 1.000
365
pass


OPEN_NEG
D287_N_GNT
P31
−2.000
−552.8mV
 1.000
365
pass


OPEN_NEG
D291_IDSEL
P44
−2.000
−552.8mV
 1.000
365
pass


OPEN_NXG
D021_N_LOC
P259
−2.000
−552.8mV
 1.000
365
pass


OPEN_NEG
D285_PCICL
P25
−2.000
−555.3mV
 1.000
365
pass


. . .


SHORT
D289_PCIAD
P41
−3.000
−555.3mV
−100.0m
365
pass


SHORT
D288_PCIAD
P42
−3.000
−552.8mV
−100.0m
365
pass


SHORT
D291_IDSEL
P44
−3.000
−552.8mV
−100.0m
365
pass


SHORT
D010_N_CBE
P49
−3.000
−555.3mV
−100.0m
365
pass


SHORT
D292_PCIAD
P50
−3.000
−550.4mV
−100.0m
365
pass












While embodiments of the present invention is shown and described, it is envisioned that those skilled in the art may devise various modifications of the present invention without departing from the spirit and scope of the appended claims.

## Claims

1. A method for pausing on a SCAN based test, said method comprising the steps of:
a) reading original SCAN chain data for a SCAN partition;
b) saving said original SCAN chain data;
c) rewriting said original SCAN chain data with a strobe character at a link in said original SCAN chain data where a pause is desired;
d) setting a compare level for an output pin associated with said strobe character so that a device under test failure results when automatic test equipment executes said SCAN partition;
e) masking all output pins except for said output pin associated with said strobe character;
f) executing said SCAN partition to failure in order to provide a paused condition;
g) performing any desired tasks during said paused condition;
h) if a paused condition is necessary on another link in said original SCAN chain data, returning to step (c) of said method, otherwise moving forward to step (i); and
i) rewriting said original SCAN chain data back to said automatic test equipment which was saved in step (b).

2. A method as defined in claim 1, wherein said strobe character is a walking strobe character.

3. A method as defined in claim 1, wherein said strobe character is a standing strobe character.