QC , VX)

.U57

No.260-79

1982

Standard Reference Materials:

Second-Surface IVIIrror

Standards of Spectral

Specular Reflectance

(SRIVPs 2023, 2024, 202*
NATIONAL BUREAU OF STANDARDS

The National Bureau of Standards' was established by an act of Congress on March 3, 1901. The Bureau's overall goal is to strengthen and advance the Nation's science and technology

and facilitate their effective application for public benefit. To this end, the Bureau conducts

research and provides: (1) a basis for the Nation's physical measurement system, (2) scientific and technological services for industry and government, (3) a technical basis for equity in trade, and (4) technical services to promote public safety. The Bureau's technical work is per- formed by the National Measurement Laboratory, the National Engineering Laboratory, and

the Institute for Computer Sciences and Technology.

THE NATIONAL MEASUREMENT LABORATORY provides the national system of

physical and chemical and materials measurement; coordinates the system with measurement

systems of other nations and furnishes essential services leading to accurate and uniform

physical and chemical measurement throughout the Nation's scientific community, industry,

and commerce; conducts materials research leading to improved methods of measurement,

standards, and data on the properties of materials needed by industry, commerce, educational

institutions, and Government; provides advisory and research services to other Government

agencies; develops, produces, and distributes Standard Reference Materials; and provides

calibration services. The Laboratory consists of the following centers:

Absolute Physical Quantities 2 — Radiation Research — Chemical Physics —

Analytical Chemistry — Materials Science

THE NATIONAL ENGINEERING LABORATORY provides technology and technical ser- vices to the public and private sectors to address national needs and to solve national problems; conducts research in engineering and applied science in support of these efforts; builds and maintains competence in the necessary disciplines required to carry out this research and technical service; develops engineering data and measurement capabilities;

provides engineering measurement traceability services; develops test methods and proposes

engineering standards and code changes; develops and proposes new engineering practices;

and develops and improves mechanisms to transfer results of its research to the ultimate user. The Laboratory consists of the following centers:

Applied Mathematics — Electronics and Electrical Engineering2 — Manufacturing

Engineering — Building Technology — Fire Research — Chemical Engineering2

THE INSTITUTE FOR COMPUTER SCIENCES AND TECHNOLOGY conducts

research and provides scientific and technical services to aid Federal agencies in the selection,

acquisition, application, and use of computer technology to improve effectiveness and

economy in Government operations in accordance with Public Law 89-306 (40 U.S.C. 759), relevant Executive Orders, and other directives; carries out this mission by managing the Federal Information Processing Standards Program, developing Federal ADP standards

guidelines, and managing Federal participation in ADP voluntary standardization activities; provides scientific and technological advisory services and assistance to Federal agencies; and

provides the technical foundation for computer-related policies of the Federal Government.

The Institute consists of the following centers:

Programming Science and Technology — Computer Systems Engineering.

'Headquarters and Laboratories at Gaithcrsburg, M D. unless otherwise noted; mailing address Washington, DC 20234.

! Some divisions within the center are located at Boulder, CO 80303.
Standard Reference Materials:

Second-Surface Mirror Standards of Spectra!

Specular Reflectance (SRM's 2023, 2024, 2025)

Joseph C. Richmond, Jack J. Hsia,

Victor R. Weidner, and David B. Wilmering

National Bureau of Standards

Washington, DC 20234

U.S. DEPARTMENT OF COMMERCE, Malcolm Baldnge, Secretary

NATIONAL BUREAU OF STANDARDS. Ernest Ambler, Director

Issued October 1S82
Library of Congress Catalog Card Number: 82-600615

National Bureau of Standards Special Publication 260-79

Natl. Bur. Stand. (U.S.), Spec. Pubt. 260-79, 41 pages (Oct. 1982)

CODEN: XNBSAV

U.S. GOVERNMENT PRINTING OFFICE WASHINGTON: 1982

For sale by the Superintendent of Documents, U.S. Government Printing Office, Washington, D.C. 20402

Price $4.50

(Add 25 percent for other than U.S. mailing)
PREFACE

Standard Reference Materials (SRM's) as defined by the

National Bureau of Standards are we 1 1- char a c t e r i z ed materials

produced in quantity and certified for one or more physical

or chemical properties. They are used to assure the accuracy

and compatibility of measurements throughout the Nation.

SRM's are widely used as primary standards in many diverse

fields in science, industry, and technology, both within the

United States and throughout the world. They are also used

extensively in the fields of environmental and clinical analysis. In many applications, traceability of quality control

and measurement processes to the national measurement system

are carried out through the mechanism and use of SRM's. For

many of the Nation's scientists and technologists it is

therefore of more than passing interest to know the details

of the measurements made at NBS in arriving at the certified

values of the SRM's produced. An NBS series of papers, of

which this publication is a member, called the NBS Special

Publication - 260 Series , is reserved for this purpose.

This 260 Series is dedicated to the dissemination of

information on different phases of the preparation, measurement, certification and use of NBS-SRM's. In general, much

more detail will be found in these papers than is generally

allowed, or desirable, in scientific journal articles. This

enables the user to assess the validity and accuracy of the

measurement processes employed, to judge the statistical

analysis, and to learn details of techniques and methods

utilized for work entailing the greatest care and accuracy.

These papers also should provide sufficient additional information not found on the certificate so that new applications

in diverse fields not foreseen at the time the SRM was originally issued will be sought and found.

Inquiries concerning the technical content of this paper

should be directed to the authors. Other questions concerned

with the availability, delivery, price, and so forth will

receive prompt attention from:

Office of Standard Reference Materials

National Bureau of Standards

Washington, D.C. 20234

George A. Uriano, Chief

Office of Standard Reference Materials
OTHER NBS PUBLICATIONS IN THIS SERIES

Catalog of NBS Standard Reference Materials

(1981-83 edition). R. W. Seward, ed., NBS

Spec. Publ. 260 (November 1981).

Michaelis. R. E.. and Wyman, L. L. Standard

Reference Materials: Preparation of White Cast

Iron Spectrochemical Standards. NBS Misc.

Publ. 260-1 (June 1964). COM 74- 1 1 06 1 **

Michaelis, R. E.. Wyman. L. L., and Flitsch. R., Standard Reference Materials: Preparation of

NBS Copper-Base Spectrochemical Standards.

NBS Misc. Publ. 260-2 (October 1964). COM74-

1 1063**

Michaelis. R. E., Yakowitz, H.. and Moore. G. A.. Standard Reference Materials: Metallographic

Characterization of an NBS Spectrometric LowAlloy Steel Standard. NBS Misc. Publ. 260-3

(October 1964). COM74-1 1060**

Hague. J. L. Mears. T. W.. and Michaelis, R. E.. Standard Reference Materials: Sources of

Information. NBS Misc. Publ. 260-4 (February

1965). COM74-M059

Alvarez. R., and Flitsch R.. Standard Reference

Materials: Accuracy of Solution X-Ray Spectrometric Analysis of Copper-Base Alloys. NBS

Misc. Publ. 260-5 (March 1965). PB 1 68068**

Shultz. J. I., Standard Reference Materials:

Methods for the Chemical Analysis of White

Cast Iron Standards. NBS Misc. Publ. 260-6

(July 1975). COM74-1 1068**

Bell. R. K., Standard Reference Materials:

Methods for the Chemical Analysis of NBS

Copper-Base Spectrochemical Standards. NBS

Misc. Publ. 260-7 (October 1965). COM74-

1 1067**

Richmond. M.S.. Standard Reference Materials:

Analysis of Uranium Concentrates at the

National Bureau of Standards. NBS Misc. Publ.

260-8 (December 1965). COM74-1 1066**

Anspach. S. C. Cavallo. L. M. Garfinkel, S. B. Hutchinson, J. M. R.. and Smith, C. N.. Standard Reference Materials: Half Lives of Materials

Used in the Preparation of Standard Reference

Materials of Nineteen Radioactive Nuclides

Issued by the National Bureau of Standards

NBS Misc. Publ. 260-9 (November 1965).

COM74-1 1065**

Yakowitz. H.. Vieth, D. L.. Heinrich. K. F. J., and

Michaelis, R. E.. Standard Reference Materials:

Homogeneity Characterization on NBS Spectrometric Standards II: Cartridge Brass and LowAlloy Steel, NBS Misc. Publ. 260-10 (December

1965). COM 74-1 1064**

Napolitano, A., and Hawkins. E. G., Standard

Reference Materials: Viscosity of Standard

Lead-Silica Glass, NBS Misc.' Publ. 260-11

(November 1966). NBS Misc. Publ. 260-11**

Yakowitz, H.. Vieth, D. L.. and Michaelis. R. E., Standard Reference Materials: Homogeneity

Characterization of NBS Spectrometric Standards III: White Cast Iron and Stainless Steel Powder Compact. NBS Misc. Publ. 260-12

(September 1966). NBS Misc. Publ. 260-12**

Spijkerman, J. L., Snediker, D. K.. Ruegg, F. C,

and DeVoe. J. R.. Standard Reference Materials: Mossbauer Spectroscopy Standard for the

Chemical Shift of Iron Compounds. NBS Misc.

Publ. 260-13 (July 1967). NBS Misc. Publ.

260-13**

Menis. O.. and Sterling. J. T., Standard Reference

Materials: Determination of Oxygen in Ferrous

Materials - SRM 1090. 1091, and 1092. NBS

Misc. Publ. 260-14 (September 1966). NBS Misc.

Publ. 260-14**

Passaglia. E.. and Shouse. P. J. Standard Refer- ence Materials: Recommended Method of Use

of Standard Light-Sensitive Paper for Calibrating Carbon Arcs Used in Testing Textiles for Colorfastness to Light. NBS Misc. Publ. 260-15

(June 1967). (Replaced by NBS Spec. Publ.

260-41.)

Yakowitz. H.. Michaelis. R. E.. and Vieth. D. L.. Standard Reference Materials: Homogeneity

Characterization of NBS Spectrometric Standards IV: Preparation and Microprobe Characterization of W-20% MO Alloy Fabricated by

Powder Metallurgical Methods. NBS Spec.

Publ. 260-16 (January 1969). COM74-I 1062**

Catanzaro. E. J.. Champion. C. E., Garner, E. L.. Marinenko, G.. Sappenfield. K. M.. and Shields.

W. R. Standard Reference Materials: Boric

Acid: lsotopic and Assay Standard Reference

Materials. NBS Spec. Publ. 260-17 (February

1970). Out of Print

i v
Geller, S. B.. Mantek, P. A., and Cleveland. N. G.. Standard Reference Materials: Calibration of NBS Secondary Standard Magnetic Tape

(Computer Amplitude Reference) Using the

Reference Tape Amplitude Measurement

"Process A, "NBS Spec. Publ. 260-18 (November

1969). (See NBS Spec. Publ. 260-29.)

Paule, R. C. and Mandel. J.. Standard Reference

Materials: Analysis of Interlaboratory Measurements on the Vapor Pressure of Gold (Certification of Standard Reference Material 745). NBS

Spec. Publ. 260-19 (January 1970). PB19007I**

Paule, R. C, and Mandel. J.. Standard Reference

Materials: Analysis of Interlaboratory Measurements on the Vapor Pressures of Cadmium and

Silver. NBS Spec. Publ. 260-21 (January 1971).

COM74-1 1359**

Yakowitz. H., Fiori. C. E., and Michaelis. R. E.. Standard Reference Materials: Homogeneity

Characterization of Fe-3 Si Alloy, NBS Spec.

Publ. 260-22 (February 1971). COM74-1 1357**

Napolitano. A., and Hawkins. E. G., Standard

Reference Materials: Viscosity of a Standard

Borosilicate Glass, NBS Spec. Publ. 260-23

(December 1970). COM71-00157**"

Sappenfield, K. M.. Marineko. G.. and Hague. J. L.. Standard Reference Materials: Comparison

of Redox Standards. NBS Spec. Publ. 260-24

(January 1972). COM 72-50058**

Hicho, G. E., Yakowitz. H.. Rasberry. S. D.. and

Michaelis, R. E., Standard Reference Materials:

A Standard Reference Material Containing

Nominally Four Percent Austenite. NBS Spec.

Publ. 260-25 (February 1971). COM74-1 1356**

Martin. J. F.. Standard Reference Materials:

National Bureau of Standards-US Steel Corportion Joint Program for Determining Oxygen and

Nitrogen in Steel. NBS Spec. Publ. 260-26

(February 1971). 85 cents* PB 81 176620

Garner, E. L., Machlan. L. A., and Shields. W. R.. Standard Reference Materials: Uranium

Isotopic Standard Reference Materials. NBS

Spec. Publ. 260-27 (April 1971). COM74-

1 1358**

Heinrich. K. F. J.. Myklebust. R. L.. Rasberry. S. D.. and Michaelis. R. E.. Standard Reference

Materials: Preparation and Evaluation of

SRM's 48 1 and 482 Gold-Silver and GoldCopper Alloys for Microanalysis. NBS Spec.

Publ. 260-28 (August 1971). COM7 1-50365**

Geller. S. B.. Standard Reference Materials: Calibration of NBS Secondary Standard MagneticTape (Computer Amplitude Reference) Using

the Reference Tape Amplitude Measurement

"Process A-Model 2." NBS Spec. Publ. 260-29

(June 1971). COM7I-50282

Gorozhanina. R. S.. Freedman. A. Y., and

Shaievitch, A. B. (translated by M. C. Selby).

Standard Reference Materials: Standard

Samples Issued in the USSR (A Translation

from the Russian). NBS Spec. Publ. 260-30 (June

1971). COM71-50283**

Hust. J. G.. and Sparks. L. L. Standard Reference

Materials: Thermal Conductivity of Electrolytic Iron SRM 734 from 4 to 300 K. NBS Spec. Publ.

260-31 (November 1971). COM7I-50563**

Mavrodineanu. R., and Lazar. J. W., Standard

Reference Materials: Standard Quartz Cuvettes,

for High Accuracy Spectrophotometry. NBS

Spec. Publ. 260-32 (December 1973). 55 cents*

SN003-003-OI213-I

Wagner. H. L.. Standard Reference Materials:

Comparison of Original and Supplemental

SRM 705. Narrow Molecular Weight Distri- bution Polystyrene. NBS Spec. Publ. 260-33

(May 1972).' COM72-50526**

Sparks. L. L.. and Hust. J. G., Standard Reference

Materials: Thermoelectric Voltage. NBS Spec.

Publ. 260-34. (April 1972). COM72-5037 I ** Sparks. L. L., and Hust. J. G.. Standard Refer- ence Materials: Thermal Conductivity of

Austenitic Stainless Steel. SRM 735 from 5 to 280 K. NBS Spec. Publ. 260-35 (April 1972.)

35 cents* COM 72-50368**

Cali. J. P.. Mandel. J.. Moore. L. J., and Young. D.

S.. Standard Reference Materials: A Referee

Method for the Determination of Calcium in Serum. NBS SRM 915. NBS Spec. Publ. 260-36

(May 1972). COM72-50527**

Shultz. J. I. Bell.. R. K. Rains. T. C. and Menis.

O.. Standard Reference Materials: Methods of Analysis of NBS Clay Standards. NBS Spec.

Publ. 260-37 (June 1972). COM72-50692**

Richmond. J. C. and Hsia. J. J.. Standard Refer- ence Materials: Preparation and Calibration of

Standards of Spectral Specular Reflectance.

NBS Spec. Publ. 260-38 (May 1972). COM72-

50528**

Clark, A. F.. Denson. V.A.. Hust. J. G.. and

Powell. R. L.. Standard Reference Materials

The Eddy Current Decay Method for Resistivity

Characterization of High-Purity Metals. NBS

Spec. Publ. 260-39 (May 1972). COM72-50529**
McAdie, H. G.. Garn. P.D., and Menis, O.. Standard Reference Materials: Selection of Thermal

Analysis Temperature Standards Through a Cooperative Study (SRM 758. 759. 760). N BS

Spec. Publ. 260-40 (August 1972.) COM72-

50776**

Wood. L. A., and Shouse. P. J.. Standard

Reference Materials: Use of Standard LightSensitive Paper for Calibrating Carbon Ares

Used in Testing Textiles for Colorfastness to Light, NBS Spec. Publ. 260-41 (August 1972)

COM 72-50775**

Wagner. H. L. and Verdier. P. H.. eds.. Standard

Reference Materials: The Characterization of

Linear Polyethylene. SRM 1475. NBS Spec.

Publ. 260-42 (September 1972). COM72-

50944**

Yakowitz. H.. Ruff, A. W.. and Michaelis. R. E.. Standard Reference Materials: Preparation and

Homogeneity Characterization of an Austenitic

Iron-Chromium-Nickel Alloy, NBS Spec. Publ.

260-43 (November 1972). COM73-50760**

Schooley. J. F.. Soulen. R. J.. Jr.. and E\ans. G. A..

Jr.. Standard Reference Materials: Preparation

and Use of Superconducti\ e Fixed Point

Devices. SRM 767. NBS Spec. Publ. 260-44

(December 1972). COM73-50037**

Greifer. B.. Maienthal, E. J. Rains. T. C. and

Rasberry. S. D.. Standard Reference Materials:

Powdered Lead-Based Paint. SRM 1579. NBS

Spec. Publ. 260-45 (March 1973). COM73-

50226**

Hust. J. G.. and Giarratano, P. J.. Standard Refer- ence Materials: Thermal Conducti\ity and

Electrical Resistivity Standard Reference Materials: Austenitic Stainless Steel. SRM's 735 and

798. from 4 to 1200 k. NBS Spec. Publ. 260-46

(March 1975). SN003-003-0 1278-5 Hust. J. G.. Standard Reference Materials: Electrical Resistivity of Electrolytic Iron. SRM 797.

and Austenitic Stainless Steel. SRM 798. from 5 to 280 K. NBS Spec. Publ. 260-47 (Februan

1974). COM74-50176**

Mangum. B. W.. and Wise. J. A.. Standard Refer- ence Materials: Description and Use of Precision

Thermometers for the Clinical Laboratory.

SRM 933 and SRM 934. NBS Spec. Publ. 260-4N

(May 1974). 60 cents* SN003-003-0 1 278-5

Carpenter. B. S.. and Reimer. G. M.. Standard

Reference Materials Calibrated Glass Standards lor Fission Track Use. NBS Spec. Publ.

260-49 (November 1974). COM74-5IIX5

Hust. J. G.. and Giarratano. P. J.. Standard Refer- ence Materials: Thermal Conductiuty and Electrical Resistivity Standard Reference Materials:

Electrolytic Iron. SRM's 734 and 797 from 4 to 1000 K. NBS Spec. Publ. 260-50 (June 1975).

SI. 00* SN0O3-0O3-OI425-7

Mavrodineanu. R., and Baldwin. J. R.. Standard

Reference Materials: Glass Filters As a Standard

Reference Material for Spectrophotometry:

Selection: Preparation: Certification; Use-SRM

930. NBS Spec. Publ. 260-51 (November 1975).

SI. 90* SN003-003-0I48I-S

Hust. J. G.. and Giarratano. P. J.. Standard Refer- ence Materials: Thermal Conductivity and Electrical Resistivity Standard Reference Materials

730 and 799. from 4 to 3000 K. NBS Spec. Publ.

260-52 (September 1975). SI. 05* SN003-003-

01464-8

Durst. R. A.. Standard Reference Materials:

Standardization of pH Measurements, NBS

Spec. Publ. 260-53 (December 1975. Revised).

SI. 05 SN003-OO3-0I55I-2

Burke. R. W.. and Ma\ rodincanu. R. Standard

Reference Materials: Certification and Use ol Acidic Potassium Dichromate Solutions as an

Ultraviolet Absorbance Standard. NBS Spec.

Publ. 260-54 (August 1977). S3.00* SN003-003-

01828-7

Ditmars. D. A.. Cezairli_\an. A.. Ishihara. S.. and

Douglas. T. B.. Standard Reference Materials:

Enthalpy and Heat Capacity: Molybdenum

SRM 781. from 273 to 2S00 K. NBS Spec. Publ.

260-55 (September 1977). S2.20* SN003-003-

0 1 836-8

Powell. R. L... Sparks. L. I... and Hum. .1. G.. Standard Reference Materials: Standard

Thermocouple Materials. Pt.67: SRM 1967. NBS

Spec. Publ. 260-56 (Februarv 1978). S2.20*

SN003-003-0ISS64

Call. J. P. and Plebanski. T .. (nude to United

States Reference Materials. NBS Spec. Publ.

260-57 (Februan, 1978). S2.20* PB 277173

Barnes. .1. D.. anil Martin. G. M„ Standard Reler- ence Materials: Polyester Film lor Oxygen Gas

Transmission Measurements SRM 1470. NBS

Spec. Publ. 260-58 (June 1979) S2.00* SN003-

003-02077

Chang. 1.. and Kahn. A. H. Standard Relcrcncc

Materials: Electron Paramagnetic Resonance

Intensiu Standard: SRM 2601. NBS Spec.

Publ. 260-59 (August I97S) S2.30* SN003-

003-01975-5

vi
Velapoldi, R. A., Paule, R. C, Schaffer, R.,

Mandel, J., and Moody, J. R., Standard Refer- ence Materials: A Reference Method for the

Determination of Sodium in Serum, NBS Spec.

Publ. 260-60 (August 1978). S3.00* SN003-003

01978-0

Verdier, P. H., and Wagner. H. L., Standard Refer- ence Materials: The Characterization of Linear

Polyethylene (SRM 1482, 1483, 1484), NBS

Spec. Publ. 260-61 (December 1978). SI. 70*

SN003-003-02006-1

Soulen, R. J., and Dove, R. B., Standard Reference

Materials: Temperature Reference Standard

for Use Below 0.5 K (SRM 768). NBS Spec.

Publ. 260-62 (April 1979). S2.30* SN003-003-

02047-8

Velapoldi, R. A.. Paule, R. C, Schaffer, R.

Mandel, J., Machlan, L. A., and Gramlich, J. W.,

Standard Reference Materials: A Reference

Method for the Determination of Potassium in Serum. NBS Spec. Publ. 260-63 (May 1979).

S3.75* SN003-003-02068

Velapoldi, R. A., and Mielenz, K. D., Standard

Reference Materials: A Fluorescence Standard

Reference Material Quinine Sulfate Dihydrate

(SRM 936), NBS Spec. Publ. 260-64 (January

1980). S4.25* SN003-003-02 148-2

Marinenko, R. B., Heinrich, K. F. J., and Ruegg,

F. C, Standard Reference Materials: MicroHomogeneity Studies of NBS Standard Reference

Materials, NBS Research Materials, and Other

Related Samples. NBS Spec. Publ. -260-65

(September 1979). S3.50* SN003-003-021 14-1 Venable, W. H., Jr.. and Eckerle, K. L., Standard

Reference Materials: Didymium Glass Filters for Calibrating the Wavelength Scale of Spectrophotometers (SRM 2009. 2010, 2013). NBS Spec.

Publ. 260-66 (October 1979). S3.50* SN003-003-

02127-0

Velapoldi. R. A.. Paule, R. C, Schaffer. R.. Mandel.

J., Murphy. T. J., and Gramlich. J. W.. Standard

Reference Materials: A Reference Method for the Determination of Chloride in Serum, NBS Spec.

Publ. 260-67 (November 1979). S3.75* SN003-

003-02136-9

Mavrodineanu, R. and Baldwin. J.R.. Standard

Reference Materials: Metal-On-Quartz Filters as a Standard Reference Material for Spectrophotometry-SRM 2031. NBS Spec. Publ. 260-68

(April 1980). S4.25* SN003-0O3-O2 167-9

Velapoldi, R. A., Paule, R. C, Schaffer, R.,

Mandel. J., Machlan. L. A., Garner, E. L., and

Rains, T. C, Standard Reference Materials: A

Reference Method for the Determination of

Lithium in Serum, NBS Spec. Publ. 260-69 (July)

1980). S4.25* SN003-003-022I4-4

Marinenko, R. B., Biancaniello, F., Boyer, P. A.,

Ruff. A. W., DeRobertis, L.. Standard Reference

Materials: Preparation and Characterization of an Iron-Chromium-Nickel Alloy for Microanalysis, NBS Spec. Publ. 260-70* (May 1981).

$2.50* SN0O3-003-02328-1

Seward, R. W., and Mavrodineanu, R., Standard

Reference Materials: Summary of the Clinical

Laboratory Standards Issued by the National

Bureau of Standards, NBS Spec. Publ. 260-71

(November 1981). S6.50* SN003-003-0238 1-7 Reeder, D.J., Coxon, B.. Enagonio, D., Christensen,

R. G., Schaffer, R., Howell, B. F.. Paule, R. C,

Mandel, J., Standard Reference Materials: SRM

900, Antiepilepsy Drug Level Assay Standard,

NBS Spec. Publ. 260-72 (June 1981). S4.25*

SN003-003-02329-9

Interrante. C. G., and Hicho, G. E., Standard Refer- ence Materials: A Standard Reference Material

Containing Nominally Fifteen Percent Austenite

(SRM 486), NBS Spec. Publ. 260-73 (January

1982). S2.75* SN003-003-02386-8

Marinenko. R. B., Standard Reference Materials:

Preparation and Characterization of K-411 and

K-414 Mineral Glasses for Microanalysis: SRM

470. NBS Spec. Publ. 260-74 (April 1982).

S3. 50 SN003-O03-023-95-7

Weidner. V. R., Hsia, J. J., Standard Reference

Materials: Preparation and Calibration of First Surface Aluminum Mirror Specular Reflectance

Standards (SRM 2003a), NBS Spec. Publ. 260-75

(May 1982). S3. 75 SN003-003-023-99-0

Hicho. G. E. and Eaton. E. E.. Standard Reference

Materials: A Standard Reference Material

Containing Nominally Five Percent Austenite

(SRM 485a), NBS Spec. Publ. 260-76 (in press).

Furukawa, G. T.. Riddle. J. L.. Bigge. W. G.. and

Pfieffer. E. R.. Standard Reference Materials:

Application of Some Metal SRM's as Thermometry Fixed Points. NBS Spec. Publ. 260-77 (in

press).

vii
Hicho, G. E. and Eaton, E. E., Standard Reference

Materials: Standard Reference Material Containing Nominally Thirty Percent Austenite (SRM

487), NBS Spec. Publ. 260-78 (in press).

Richmond, J. C, Hsia, J. J., Weidner, V. R., and

Wilmering, D. B., Standard Reference Materials:

Second Surface Mirror Standards of Specular

Spectral Reflectance (SRM s 2023, 2024, 2025),

NBS Spec. Publ. 260-79 (in press).

* Send order with remittance to Superintendent

of Documents, US Government Printing Office

Washington, DC 20402. Remittance from

foreign countries should include an additional

one-fourth of the purchase price for postage. ** May be ordered from: National Technical

Information Services (NT1S). Springfield

Virginia 22151.

vi
TABLE OF CONTENTS

Page

Introduction 2

Required Properties 2 Mirror Types and Materials 3

Vacuum Deposited Aluminum 5

Manufacture of Standards 6

Calibration of the Master Standards 8

Calibration of the Standard Reference Material 2023

and 2024 Second Surface Mirrors 8

Calibration of Wedge Standards 9

Uncertainties 14

Cleaning 16

The Certificates of Calibration 16

References 31

LIST OF TABLES

Page

1. Measured Total Specular Spectral Reflectance,

for 6° Incidence, of Wedge Standards and First

Surface Reflectance of Fused Silica Cover Plate 10

2. Index cf Refraction, n, of Cover Plate and

Direction, in Degrees from Normal, of First Four

Reflected Beams 13

3. Reflectance for Wedge Standard 95W 15

ix

Second-Surface Mirror Standards of Spectral Specular

Reflectance [SRM's 2023, 2024, 2025]

by

Joseph C. Richmond, Jack J. Hsia, Victor R. Weidner

and David B. Wilmering

ABSTRACT

NBS was requested by the Department of Energy to prepare, calibrate

and disseminate standards of spectral specular reflectance for use in

calibrating ref lectometers used to evaluate the solar specular reflectance of concentrating mirrors used in solar energy systems.

The mirror chosen was a second-surface mirror of vacuum-deposited

aluminum on optically polished vitreous quartz backed up with a second

plate of ground and polished vitreous quartz cemented to the back of the

mirror. Standards were prepared in two sizes, 51 x 51 mm, and

25 x 101 mm.

The cost of developing and calibrating the standards was included

in a contract issued by the Solar Energy Research Institute of Golden,

Colorado, which is financed by the Department of Energy.

Key Words: aluminum mirrors; directional specular reflectance;

reflectance specular; reflectance standards; second surface mirrors;

solar reflectance; specular spectral reflectance.

1
In troduction

The Department of Energy requested the National Bureau of Standards

to prepare, calibrate and disseminate physical standards of specular

spectral reflectance for use in calibrating ref lectometers used for

evaluating the solar reflectance of collector mirrors used in concentrating solar energy systems. The cost of developing the standards was included in a contract issued by the Solar Energy Research Institute of

Golden, Colorado, which is financed by the Department of Energy.

Required Properties

The properties required of the standards relate to the reflectance,

size, specularity and durability of the standards.

Reflectance refers to the value of the specular spectral reflectance, the wavelength range over which it is evaluated, and the angle or angles of incidence at which it is evaluated. The spectral range of 250

to 2500 nm was selected for several reasons. The first and most important reason is that the NBS high-accuracy specular spectral ref lectometer

covers this wavelength range. Most commercial instruments used for

specular spectral reflectance measurements are also restricted to this

wavelength range. About 98.8 percent of the terrestrial solar irradiance

at air mass 1.5 is included in this spectral range. While there is

essentially no terrestrial solar irradiance at wavelengths shorter than

300 nm, the inclusion of data from 250 to 300 nm will make the standards

more useful in calibrating commerically available spectral ref lectometers

.

The reflectance of the standards should be high, on the order of 90%,

over this spectral range. Since the collector mirrors will be used at

off-normal angles of incidence of 45° or more, the reflectance of the

standards should be evaluated at angles of incidence of at least 30° and

45° from normal.

Size refers to the shape and dimensions of the standards, width,

length and thickness. While disc-shaped standards would be useful in

some cases, rectangular standards are easier to prepare, and have the

advantage of easily determined orientation in use. The normal size of

reflectance standards is about 50 mm (2 in) square. If used in an

Edwards-type sphere, the width should be no more than 38 mm (1.5 in) and

a standard with a width of 25 mm (1 in) may be easier to use. For

measuring specular reflectance at large angles of incidence with some

instruments a length of 75 mm or more is required. It was decided to

prepare standards in two sizes, 51 mm (2 in) square, and 25 x 102 mm (1 x 4 in). There is no special requirement on thickness except that the

standard should be thick enough to resist bending and breakage, and not

too thick for easy handling. A thickness of about 6 mm (1/4 in) was

selected. There is also a requirement that the front and back surfaces

of the standard be parallel since the alignment of a sample is determined by contact of the front surface with aligning points in some instruments, and by contact of the back surface in others.

2
Specularity may be defined as the ratio of the specular reflectance

to the hemispherical reflectance. Ideally, this ratio should be one with none of the incident flex reflected in directions other than the

specular direction. This cannot be attained experimentally, but it has

been closely approached by these standards, as will be discussed later.

Durability refers to the ability of the standard to retain its

calibration value indefinitely. The three mechanisms that cause the

reflectance of the standard to change with time are 1) physical damage,

primarily abrasion, 2) chemical corrosion such as oxidiation or tarnish,

and 3) surface contamination. The standard should have a hard surface

to resist abrasion, be chemically inert or suitably protected to resist

chemical corrosion, and easily cleanable to permit surface contamination

to be removed and the initial reflectance restored.

Mirror Types and Materials

Specular reflectors of high reflectance are almost always optically

smooth metallic surfaces. Such surfaces can be prepared by optically

polishing massive metal, or by vacuum deposition or sputtering of a thin

opaque layer of metal on a polished substrate.

Mirrors are of two types, first surface and second surface. In a first-surface mirror the metal surface is directly exposed to the

atmosphere, so that the incident rays hit the metal directly. In a second-surface mirror the metal surface has a protective layer between

it and the atmosphere. This protective layer may be a thin sheet of

optically polished transparent material, such as glass, to which a thin

film of the reflecting metal is applied, or a thin film of metal applied

to an opaque substrate and covered with a second layer of a protective

transparent material. In a second-surface mirror the incident rays pass

through the protective layer before and after reflection. The transmitting layer, called the superstrate, can be designed to have good

resistance to abrasion, to be impermeable to protect the metal against

chemical corrosion, and easily cleanable so that surface contamination

can be removed without affecting the reflecting layer. In addition,

most heliostat mirrors are second surface mirrors, and can be best

simulated by a second surface mirror standard. For these reasons, a second-surface mirror was selected for use as the standard.

Three metals have reasonably high reflectance in the solar range,

aluminum, rhodium and silver. Both aluminum and silver are soft, and

not very resistant to abrasion. Rhodium is much harder and more re- sistant to abrasion. It would be the best of the three metals for a first-surface mirror, since it is also chemically inert. Its reflectance is low compared to that of silver and aluminum. This, combined

with its high cost and the difficulty in obtaining good adhesion of a vacuum-deposited layer to a polished substrate make it unsuitable for

use as a second surface mirror standard. Previous experience at NBS

3
indicates that it is difficult to produce first surface rhodium mirrors

with uniform reflectance over the surface of a single 50 x 50 mm sample.

Both aluminum and silver are suitable for use as the reflecting layer in

a second-surface mirror.

A large majority of the concentrating mirrors used in solar energy

systems consist of wet chemical reduction silver on glass. While the

wet chemical reduction process has a long history of use in the manufacture of mirrors, the application process is still something of an

art. The detailed chemistry of the reduction process, and particularly

the factors that must be controlled and the specific conditions required

to produce a high-reflectance adherent coating on glass are not known

with sufficient accuracy to assure reliable production of such flims.

In addition, the reflectance of silver, while very high at wavelengths

above about 500 nm, drops abruptly below 400 nm to a value near zero at

about 320 nm.

Aluminum is used for some first surface concentrating mirrors, in

the form of polished metal, either sheet or foil, and as a vacuum

deposited film on a plastic substrate. The reflectance of aluminum is

only slightly lower than that of silver at wavelengths longer than about

1000 nm, and is much higher than that of silver at wavelengths below 400

nm. There is a broad shallow absorption peak at about 825 nm, where the

reflectance drops below 90%. Aluminum is easily applied by vacuum

deposition, and adheres readily to most substrates. The factors affecting the deposition process are well known, and can be easily controlled.

For these reasons aluminum was selected as the reflecting layer of the

second surface mirror standards.

Optical quality polished vitreous quartz is significantly harder

than glass, and hence more resistant to abrasion. It has high transmittance over a wider wavelength range than glass, particularly in the

ultraviolet. Because of its hardness, it is easier to produce an optical

polish on fused quartz than on glass. Typical values of rms roughness

of optically polished materials are listed in [1] as 4.1 nm for flint

glass, 1.8 nm for plate glass, 1.4 nm for Pyrex glass, 0.96 nm for fused

quartz and 0.27 nm for bowl polished fused quartz.

The reflectance of a surface for normal incidence is reported in

[1] to be related to the rms roughness, a, and rms slope, m, by the

equation

R

s = RQ .exp [-(4.iT.a)

2 A2

] + R

q

2

• (a/A)

4

-(A6)

2 (1)

m

where R

g is the reflectance of a sample measured for normal incidence

with an instrument of acceptance angle A9 . When o<<\, the second term

becomes negligible, and may be omitted. The first term is for the

reduction in specular reflectance due to diffraction, and the second

term is the loss due to diffusely reflected light.

4
Vacuum Deposited Aluminum

Hass [2] reports "It is well known that the optical properties of

all evaporated films are strongly influenced by many factors, such as speed of deposition, pressure during the evaporation, thickness of the

coating, temperature of the substrate, and aging in air."

Vacuum deposited aluminum is highly reactive, and oxidizes on exposure to air. The oxide forms a transparent tightly adherent layer

of low permeability to oxygen, which protects the aluminum against

further oxidation. This oxide layer accounts for the excellent resistance of aluminum to atmospheric corrosion. The rate at which the

aluminum oxidizes, the thickness of the coating eventually formed, and

the time required to reach the maximum thickness are strongly influenced

by the purity of the aluminum, its compactness, the pressure (vacuum)

during evaporation, the speed of evaporation, and conditions, such as temperature and humidity, during aging. Hass [3] describes a method of

applying pure (99.99%) aluminum in a vacuum of 1 x 10~ torr at a deposition

rate of 50 nm per second. A shutter in front of the samples protects

substrates against contamination during outgassing of the evaporation

sources and their charges. The shutter is opened when the evaporation

reaches constant speed, and is closed when a film of the desired thickness is obtained. This method was used by Bennett et al [4] for the

preparation of samples for the evaluation of the reflectance of aluminum.

They found that films prepared by this procedure had higher reflectances

than those^prepared in the optics shop at their facility, where a vacuum

of 1 x 10 torr was used, and where deposition rates were on the order

of 5 nm per second. The main differences in the reflectances occurred

in the ultraviolet and visible portions of the spectrum. Hass [3] shows

graphs of the effect of pressure and deposition time on the reflectance

of aged vacuum deposited aluminum.

Earlier work at NBS, about 1968-1971, showed that the ultraviolet

reflectance of first-surface mirrors of vacuum deposited aluminum,

prepared for NBS by a commercial coating laboratory, continued to

decrease over a period of over one year. The samples were allowed to

age for over two years, in order to be sure that the reflectance had

reached a stable value, before calibration as specular spectral reflectance standards.

Bennett et al.^5] prepared vacuum deposited films of aluminum at a pressure of 1 x 10 torr, and found that the reflectance of these

films measured in an atmosphere of dry nitrogen, was about l%^higher

than that of aged samples coated in a vacuum of about 1 x 10 torr.

A brief search of the literature for data on the stability of the

reflectance of second-surface mirrors of vacuum-deposited aluminum

proved fruitless. From the known properties of aluminum it is believed

that the second-surface mirrors will be highly stable in reflectance.

The aluminum was deposited by the procedure described by Hass [3], and

hence the aluminum at the quartz-aluminum interface should be free from

5
contamination due to the evaporation process. This interface is

protected against oxidation by the optical quality vitreous quartz

on the front, and by five, and perhaps six, separate layers on the back.

The aluminum was deposited to a thickness of about 150 nm, about three

times the thickness required for an opaque coating. A protective

layer of silicon monoxide was deposited on top of the aluminum before it

was removed from the vacuum chamber, followed by a second coat of

aluminum and a second coat of silicon monoxide. If any oxygen penetrated

the silicon monoxide coating, it immediately formed a layer of

aluminum oxide beneath the silicon monoxide. A backing plate of

vitreous quartz was cemented to the back of the aluminum coating, on

top of the second silicon monoxide layer.

Manufacture of Standards

The standards were manufactured in the NBS Optical Shop. The top

plate, to which the reflective coating of aluminum was later applied,

was of optical quality vitreous quartz, ground to a thickness of 2 mm,

and polished on both sides. A bowl polishing technique was used, which

produced an AA roughness of about 0.7 nm. The two sides of each plate

were flat to within one fringe and parallel to within 0.01 mm.

The preparation of the standards was supervised by Edward P. Muth,

Chief of the NBS Optical Shop. Grinding and polishing of the plates

and cementing of the mirrors was done by John E. Fuller, and the coating

was done by David B. Wilmering.

The base plate was similarly of vitreous quartz, ground to a thickness of 3.7 mm, with a fine ground finish on one side and an optical

polish on the other.

The plates, both top and base, were thoroughly cleaned before

coating. The cleaning procedure consisted of 1) hand scrubbing with a warm solution of detergent, followed by a rinse in warm tap water, 2) a rinse with distilled water immediately following the tap water rinse, 3)

degreasing in an alcohol degreaser, in which the surface was rinsed with

freshly distilled alcohol, 4) a light scrub with absorbent cotton and CP

acetone, followed by an acetone rinse. The plates were then subjected

to a critical visual inspection, and those showing any sign of a residual deposit were recleaned. The first operation in the coating

chamber consisted of a corona discharge cleaning, which was the final

cleaning

.

The coating chamber has a shutter that completely covers the plates

during evacuation and the first stage of evaporation of aluminum. The

deposition of aluminum was started with the shutter closed. After the

chamber was completely filled with aluminum vapor, the shutter was

opened, and a layer of high-purity aluminum was applied to a thickness

of 150 nm in a period of about 5 seconds. The thickness of the aluminum

coating was monitored during application with a quartz crystal thickness
gage. An overcoating of a half wavelength of silicon monoxide was

applied over the aluminum before the vacuum was broken. The silicon

monoxide coating inhibits oxidation of the aluminum when exposed to air.

Careful visual examination of the first few mirrors prepared by the

above procedure revealed the presence of a few scattered pinholes in the

aluminum coating that were readily visible when the mirror was held up

to the sun or a strong light. The reflectance of areas of the same

mirror with and without pinholes was measured with a ref lectometer with

an uncertainty of 0.002 in reflectance, but no difference could be

detected. Measurements of the transmittance of an area containing

pinholes were made with equipment that can measure transmittance of

0.001, but no transmittance was detected. On the basis of the above

measurements the pinholes were considered to be a cosmetic defect.

However, the aluminum coating was removed and the mirrors were recoated

following a modified procedure.

The modified procedure included the application of a first coat of

aluminum and silicon monoxide as described above, followed by second

coatings of aluminum and silicon monoxide, applied without breaking the

vacuum. In addition, a single similar coat of aluminum and silicon

monoxide was applied to the polished face of the backing plate.

The coated sides of the two plates were cemented together with an epoxy optical cement, in a jig that held the two sides of the finished

standard parallel to about 0.01 mm.

The complete standard is about 5.8 mm thick, with a highly polished

surface that is easily cleaned on the front (reflecting) surface, and a fine ground finish on the back, so that the calibrated surface can be

easily identified. The flat standards were made in sizes of 51 x 51

mm, and 25 x 101 mm, and are designated as SRM's 2023 and 2024

respectively

.

A few samples in the 25 x 101 mm size were prepared with both top

and bottom plates tapered with an included plane angle of 10 mrad.

These samples were also cemented by use of a jig, to keep the top and

bottom surfaces of the finished mirror parallel to 0.01 mm. The

reflected beams from the vitreous quartz first surface and the

aluminum second surface thus diverge by about 20 mrad, and can be

separately distinguished and measured if there is sufficient distance

between the mirror and the detector.

The specular reflectance of an uncoated top plate was measured with

the NBS high accuracy specular ref lectometer , at an angle of incidence

of 6° from normal. The total reflectance of each tapered mirror at an angle of incidence of 6° from normal was measured on the highprecision integrating sphere ref lectometer . The values for these two

measured reflectances, and the values of reflectance for the reflected

beams from the vitreous quartz first surface and the aluminum second

7
surface, computed from the measured values, will be supplied with the

tapered mirrors, which are available for sale as SRM 2025.

Calibration of the Master Standards

Calibration of the two master standards was accomplished by measure- ments on the NBS Reference Specular Reflectometer-Spectrophotometer [6]. This instrument measures specular reflectance by absolute techniques.

The measurements are made as a function of wavelength, angle of

incidence, and polarization.

In calibrating the master second surface mirrors, the instrument

was operated with a spectral pass band of 10 nm. The collimated incident

beam had a cross section of 18 mm x 12 mm at the sample. The incident

beam was polarized either parallel or normal to the plane of incidence.

The sample or test mirror was mounted on a turntable. The surface of the

mirror and the axis of rotation of the turntable occupied a common

vertical plane, thus making it possible to vary the angle of incidence.

A complete description of these measurement procedures and a more

detailed explanation of the mechanics of the specular reflectometer is

given in the accompanying reprint documenting that instrument.

The calibration of the master mirrors was made at 50 nm intervals

from 250 to 900 nm, at 100 nm intervals from 900 to 1300 nm, at 250 nm

intervals from 1500 to 2500 nm, and at the laser wavelengths 632.8 and

1060 nm. The total time required to complete these calibrations was

approximately 25 hours of instrument running time per mirror. The

measurements were made at each wavelength for both vertically (S) and

horizonally (P) polarized incident beams and at three angles of incidence

The measurements were repeated six times for each of these conditions.

Three of the six measurements were made with the angles of incidence set

by rotating the mirror clockwise from the normal, and the other three

measurements were made with the angles of incidence set by rotating the

mirror counterclockwise from the normal. The final reflectance value is an average of these six measured values for a given polarization, angle

of incidence, and wavelength setting.

The overall uncertainties in the calibration of the master standards

are believed to be on the order of +0.2%. This uncertainty is based on

an analysis of the known uncertainties in the performance of the Reference Spectrophotometer [7] and the specular ref lectometer

.

Calibration of the Standard Reference Material

2023 and 2024 Second Surface Mirrors

Because of the time required to calibrate a mirror on the Reference

Specular Ref lectometer-Spectrophotometer and the cost of such calibrations it was necessary to resort to less time consuming techniques in

order to transfer the absolute reflectance scale from the master mirror

to the remainder of the second surface mirrors that would eventually be

8
issued as Standard Reference Materials. The calibration of these

mirrors was accomplished by direct comparison of each mirror with the

master mirror at each of the 25 wavelengths for which the master

mirror was previously calibrated. This comparison was made on a commercial spectrophotometer equipped with an integrating sphere

ref lectometer . The comparison was made for 6° incidence only, because

of the fixed geometry of the commerical reflectometer . The absolute

reflectance for 6° incidence of each of the Standard Reference

Material mirrors was obtained directly by setting the photometric scale

of the spectrophotometer with the master mirror so that the recorder

reading matched the corresponding absolute reflectance value of the

master mirror at a given wavelength setting. The master was then re- placed by a test mirror and the recorded value of its reflectance was

read directly from the photometric scale. The direct reading obtained

by this procedure required no further corrections. The master mirror

reflectance was checked before and after measuring each test mirror in

order to detect any drifting of the photometric scale.

The specular spectral reflectance of a master second-surface mirror

was measured at 25 wavelengths with the NBS high-accuracy specular

spectral ref lectometer at 6° incidence. The first surface reflectance,

p , of an uncoated cover plate was also measured with the same instrument

at 6° incidence, with a receptor that received only the beam reflected

from the first surface. The 6°-hemispherical reflectance of each wedge

standard was compared to that of the master standard at the same 25

wavelengths with a high-precision integrating sphere ref lectometer . The

measured reflectance ratio was multiplied by the known reflectance of

the standard at each wavelength to obtain the p spectral data reported

in Table 1.

Z

All of the cover plates were cut from a single piece of optical

quality vitreous quartz and had identical polishing treatment. It is

assummed that the reflectance of the first surface of the cover plates

is the same as that of the measured uncoated cover plate, within the

uncertainty of the measured value.

Since the cover plate is a wedge with an included plane angle of 10

mrad, it acts as a prism of low dispersing power. The index of refraction of the cover plate, at each wavelength, was computed from the

measured first surface reflectance by use of the equation for reflectance

at normal incidence,

Calibration of Wedge Standards

(2)

9
as <r in o «cr cm CM ejl CO P>«. m <n cm cm o as m on u 0) a r-~ vO m m <r <r <r en m cn m cn n cn m tn CN CM

4) 4-1 en m m C"l cn (-1 r-i en en en m en m en <n tn m en en en en en en > o O O C o o o o o o o o o O O o o o O O o a O O

o r—

1

u a. o

3 en -r in cn ao -<r co ^ co in en in r— o r» h m n n rs n in in h

r*s a\ a» o as co r-- r** *40 v43 in en o O ~r h n n ^ in in in in <r o co ao CO CO ao CO ao CO ao co goqqoqooco os os os as os c\ o ci o> Cl o

m

-3u

efl T3=u

C/3

CJCO

-3 4) U AJ 3 03

<—-i <w P- o U

01

41 >

O 0 c u

u

-a rs —i u y •** c ,—!

t-i —4

tn

ovO ~3

41

CO Q 3

<*M

3o

5

eno

U 3

41 fH J O

in m >j n eo

r*» cr* os Os co CO CQ 00 00 00

cm en <r cm co O C C' OS CO oo oo ao oo co

CM vO -a- <n oo

M3 Os Os Os 00 CO CO 00 00 00

in co cn ao m

co r» N *a *o

CO CO 00 00 CO

in os <n os in

CO I— f— o

00 00 CO 00 00

m o\ -j co m

CO N rs n5 iO

CO CO CO CO CO

en -3" r» O r» m en o O <y?y t^ry qq i—q f*f^i

CM «T vO o r~. m en o o <r

oo oo oo ao co

m m r>. o p»

in en o o -cr co co ao oo oo

O <r n n rs

<n cn <r <r

Os Os OS OS OS

O >J N N N

i—i cn cn <r <r

OS Os OS OS OS

H ^ N N fs

i—< cm en <r »r Os Os Os Os Os

es in in co oo

in in in

OS OS OS OS OS

cm m m co oo m m m «cr -3* Os OS OS OS OS

cm m m «-i r-» m in in m ^ Os OS OS OS OS

os \o in <r oo o Os OS os co

CjQ 00 00 rts m ov •» o m

co p*» r*s o \o

co co co ao co n sr n h rs m cn o O ~rQQ QQ QQ QQ H lT\ N N fs N H -T

oa oa oa oa oa

cm in m o O m >A ia in

o\ oa oa ca OA

in in tn cn co

<r» o oa co

co co oo co co m on en co tn

co n** r** \o

CO CO GO GO CO

r"i «>t r-. o r>. m m o O <r

co co co co oo

«—i m cn cm h m n <r sj

0\ 0\ C7> GA m in m tn m

<5*i> OA OA OA OA

i-H CJ of u

Ed e eu

03 a 5 u c < CJ 03

41 u

U-l 41

41 <H

os y-i

41 —i C£

03 SI u o

41 C3

ege. U

cn 3

C/3 u

13 to D

J

uc

40 S H 03 fl

—i0H

"3

4)U

3

0)

SJ

I)

c o

iJ

3

5

CO

p-* \0 tn <r oa

•*o OA OA OA oo CO CO 00 CO GO

in o in oo

CO CO mO o

CO GQ CO 00 CO

*j in co h

m m O O <r

co oo co ao oo ^ m n n n

h n n «J -J

OA OA OA OA OA

cn in in co co m in n <r <r

OA OA OA OA OA

*-o in f") oa

vO OA OA OA 00

00 CO 00 CO 00

in oa <r cr» n

CO P-* r-» \Q ^mO 00 00 CO CO GO o in r-« t-4 r-» m o O <r

co co co oo co h in fi n f"* h jn n <r

OA OA OA C?^ OA

cm in in co co in in in c *t

OA OA OA OA OA

n in <r n co ^ OA OA OA 00

GO CO CO 00 00

in oa f*i oo in

CO N P*' vO \0 CO CO CO CO CO m -^r i—* o m cn o O <r

CO 00 00 CO CO h n CI M IN

«—i cm en <r

OA OA OA OA OA

cn m m h co in in in m <r

OA OA OA OA OA

ps m m <t co

•O OA OA OA CO CO CO 00 CO CO

in o vj co uO

CO 00 f-» O \Q

CO CO CO CO 00

<r m -h r*» n m o O <r

co co oo co co

i^-i \o cn CM Pn h «n n <: -J

OA OA OA OA OA

CM U-l m f-4 o in in in tn m

OA OA OA OA OA

oa so in in r-4 \Q ON GTi OA OA

CO CO CO GO 00

r-* o n o vO

co co n \o

00 GO CO CO CO

<r in ao cn oo m m o O <r

oo oo ro oo CO

*—t sD cn cm

i— cm cn <r <r

cn oa oa oa oa

cm in m ^ in m in in <r

OA OA OA OA OA

oa in in cn co o OA OA CTi co

oo co co oo co

<T OA <T in

co r-» r-» vo

CO CO CO CO oo n »j rs r*. in cn o oa CO CO CO N CO

i-h u"*i cn CM P-» fH cm m <r <r

OA 0"N OA OA OA

cm in n co o n in n »j »j

OA OA OA OA OA

-< a o o o o o m o in o in cm n en «t <r o o o

O m o m in \o o o o o o

O m o m a in rs oo as cn o o a o o

o M3 o o o

O O H !N n

O O O O O

O m o m o m p*. o cm m

H H IN N N

10
The solution for index of refraction, n, as a function of p is

The reflectance of vitreous quartz at 6° incidence is higher than

that at normal incidence by less than 0.000005, hence the error

introduced by using equation (3) is considered negligibly small. The

indices of refraction for the 25 wavelengths at which reflectance

measurements were made are given in Table 2.

The angles of reflection for the first four beams reflected from

each standard were computed for each wavelength from the index of

refraction. The plane of incidence is taken as a plane n'Srmal to

the surface and parallel to the long sides of the standard. All angles

toward the thin end of the wedge are negative, and those toward the

thick end are positive.

The direction 9.. of the first beam, with reflectance p^, is 6°

since there is no refraction. The portion (1-p^) of the incident beam

that penetrates the cover plate is refracted at angle 9^

6

2 = sin

_1

[sin 6 /n] (4)

where 6. is -6° (there is a sign change on reflection or refraction) and

is incident on the second surface at an angle of -(d^+a) where a is the

included plane angle of the wedge. The beam is reflected at the second

surface and is incident on the first surface at an angle of -(92+2a).

The emergent beam, with reflectance > will be refracted at angle 9^

9 = sin H n sin [2a + sin '''(sin 9 /n ) ] [

. (5)

In like manner the beam, with reflectance p„, that is internally

reflected by the first surface and reflected a second time by the second

surface will be refracted at an angle 9^.

9, = sin M a sin [4a + sin ^ (sin 9.. /n ) ] ( , (6)

and the beam with reflectance p^ reflected internally twice by the first

surface and three times by the second surface will be 9,.

9,. = sin 1 |n sin [6a + sin ''"(sin 9^/n) ] |

. (7)

11
Essentially all of the flux reflected from a wedge standard is

contained in the first four reflected beams. The directions, in degree

from normal for the first four beams reflected by a wedge standard from

a collimated beam incident at -6° are given in Table 2.

Note that the angle of reflection is a function of both the wedge

effect of the cover plate and its dispersion. The wedge effect is

independent of wavelength. The dispersion angle changes with wavelengt

because the index of refraction of the cover plate changes with wavelength. If the wedge standards are used to calibrate a specular spectral ref lectometer at different wavelengths, using beam 2 reflected onci

from the second-surface aluminum coating, the dispersion effect may make

it necessary or desirable to shift the optical path slightly when

changing wavelength. If spectrally total reflectance measurements are

made, there will be a slight spread (about 0.1° for beam 2, 0.2° for

beam 3 and about 0.35° for beam 4) in the reflected beam, due to the

dispersion of the cover plate, and a slightly larger detector may be

required for spectrally total measurements than for spectral measurement

The total specular reflectance, p , of a wedge standard can be

closely approximated in terms of the reflectance, p^, of the first

surface, the transmittance, (= 1 - p^) of the first surface, and the

internal reflectance p of the second surface, as the infinite series

p

t = PjL + t1

2

-p

s + t

1

2

-p

1

-p

8

2

+ T

i

2

-P!

2

-P

s

3 + — • <8)

Rearranging and collecting terms, we set

(P

t - P

1 )P 1 = T1

2

[P1 'P

S

+ (P^Pg)

2 " (Px'Pg)

3 + (P 1* P

S )4 " " ] »

T

l

2

* P

s (p

t - p i> - UpTF • < 10 > 1 s Solving for p ,

p

t - p

i =

p

s [Ti

2

+ Vp rp

i

2]

(id

p -p-, p _ t k i

s T

i

+ Vp rp

i

The reflectances, p^, for the beam reflected once from the second

surface, p^ for the beam reflected twice from the second surface, and p for the beam reflected three times from the second surface, can be

computed from the measured values of p and p. as

12
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(12)

P

3 (13)

2 (14)

The computed values for p 9

, p_, and p, of a typical wedge standard

are given in Table 3, together with the measured values of p and p , and the sum of p^, p^, P^ anc* P^. It is interesting to note that trie

sum of the reflectances for the four beams is less than the measured p^_ by about 0. 00003 reflectance units which provides an internal check of

the validity of the computations, and also shows that the fraction of

the reflected flux in all beams beyond the fourth is negligibly small.

Equations 8 through 14 are derived on the basis of two assumptions;

1) that there is no internal absorption in the vitreous silica, and 2)

that the values of T. , p. and P

g

are independent of the angle of incidence over the range of angle! of incidence involved. There is some

slight absorption in the vitreous silica at 250 nm, and at this wavelength the absorptance appears in the computed value of p , which is the

product of the true p and the square of the transmittance of the

vitreous silica. For the thin layer of vitreous silica involved, the

internal absorptance at wavelengths from 300 to 2500 nm is negligibly

small. The reflectances p. and p are essentially independent of the

angle of incidence for angles of incidence of up to 15° from the normal

to the surface. The reflectance for a material with index of refraction

of 1.5 is 0.040000 at normal incidence, and 0.04000198 at 15° incidence.

The fractional error due to the assumption that the reflectance is

independent of the angle of incidence is thus 0.0000495 at 6° incidence,

and 0.002019 at 15°, which is well within the uncertainty of the measured

values

.

At some wavelengths, the instrument noise of the commercial spectrophotometer was slightly greater than ±0.2%. Therefore the final

uncertainty for the Standard Reference Material mirrors (the sum of the

uncertainty for the master standard and that for the measured mirror)

was increased to ±0.5%. This uncertainty is larger than the ±0.2%

assigned to the master through the more accurate determinations made on

the Reference Specular Ref lectometer . However, the uncertainty of ±0.5%

is probably realistic for the Standard Reference Material mirrors.

Uncertainties less than ±0.5% cannot be guaranteed without careful

absolute techniques.

Uncertainties

14
a

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15
An every-day working standard can be calibrated relative to the

Standard Reference Material mirror by the user for situations in which

the standard must be handled often. This will help to preserve the

Standard Reference Material mirror for periodic control of the measurement process.

Cleaning

It is recommended that the Standard Reference Material mirror be

cleaned with isopropyl alcohol followed by a rinse with distilled

water.

The Certificates of Calibration

The second-surface aluminum mirrors in which the reflecting surface

is parallel to the front surface have been designated Standard Reference

Materials 2023 and 2024. A copy of the certificate is included here

for general information. The spectral specular reflectance of the

mirrors in the wavelength range 250 to 2500 nm is shown in the graph on page 2. The wavelength scale is greatly compressed and the photometric

scale expanded in this graph, hence the absorption feature at approximately 800 nm is emphasized. The small absorption features near 1400

and 2000 nm are absorption features of the vitreous-quartz plate that

protects the aluminum coating. The data in Table 1 of the certificate

are valid for 6° incidence only. However, they are useful for other

angles of incidence near normal for essentially unpolarized sources. The data given in Table 2 of the certificate are uncertified but re- present a typical second-surface aluminum mirror. They show that

the reflectance of the mirrors for the unpolarized incident beam does

not vary significantly for angles of incidence up to 45°. The variation

in reflectance with angle of incidence may be significant for polarized

incident beams depending on the wavelength.

The wedge mirrors, in which the reflecting surface is at an angle

of 10 mrad to the front surface in a direction parallel to the long

dimension, have been designated Standard Reference Material 2025. A

copy of the certificate for these standards is also included for general

information. The measured values of p , the specular spectral re- flectance of the first surface of the optically-polished vitreous

quartz cover plate, and p , the total' specular spectral reflectance for

all beams, are certified. The computed values for the reflectances of

the first three beams reflected from the aluminum surface, and the

directions for these beams, are not certified.

16
National s. Burww oPSundirds

Ernest '^mbfcr. Director

;. DepartmerH of Commerce

Malcolnr-Baldrige 'Secreiaryi'

Standard Reference Material 2023

Second Surface Aluminum Mirror

for Specular Reflectance from

250 to 2500 nm

V. R. Weidner and J. J. Hsia

This Standard Reference Material (SRM) is intended for use in calibrating the photometric scale of specular reflecto- meters. SRM 2023 is 5. 1 x 5. 1 cm in size. The aluminum mirror is vacuum deposited on the surface of a 2-mm thick fusedquartz plate. This mirror is protected by a second fused-quartz plate attached to the first plate with epoxy cement.

The specular reflectance of the mirror was measured at 50-nm intervals from 250 nm to 900 nm, at 1 00-nm intervals from

900 nm to 1300 nm; and at 250-nm intervals from 1500 nm to 2500 nm. In addition to these wavelengths, the reflectance was also measured at the laser wavelengths 632.8 nm and 1060 nm. The certified values were determined in the following way: The reflectance of a master mirror was measured at the above

specified wavelengths with a highly accurate specular reflectometer-spectrophotometer at angles of incidence of 6° , 30°

,

and 45°. These measurements were made for both vertically and horizontally polarized incident beams. The overall

uncertainty of these measurements is ±0.2 percent. The specular reflectance of the SRM second surface mirror was

measured relative to the master mirror on a high-precision reflectometer for 6° incidence only. The certified values of

specular reflectance for the SRM mirror is based on the average value of the vertical and horizontal polarizations for the

master mirror at 6° incidence. The certified values listed in Table 1 are assigned an uncertainty of ± 0.005. The uncertified

data listed in Table 2 indicate the variation in the specular reflectance of a typical second surface SRM mirror as a function of angle of incidence and plane of polarization. Figure 1 shows the spectral distribution of a typical second

surface aluminum mirror. The wavelength scale of this plot is greatly compressed and the reflectance scale expanded to emphasize the absorption features. Note that the absorption band at 800 nm is an inherent characteristic of aluminum

mirrors. The small absorption bands near 1400 nm and 2200 nm are absorption features of the fused-quartz plate that protects the aluminum coating.

SRM 2023 can be cleaned by wiping the quartz first surface of the mirror with a soft tissue and isopropyl alcohol followed

by a rinse with distilled water. The research and development of this SRM was supported by the DoE Solar Thermal Program through the Solar

Energy Research Institute. The calibration and certification were done by the Spectrophotometry Group of the

Radiometric Physics Division. The overall direction and coordination of the preparation and technical measurements

leading to the certification were performed under the chairmanship of J. C. Richmond.

The technical and support aspects involved in the certification and issuance of this SRM were coordinated through the

Office of Standard Reference Materials by R. K. Kirby.

Washington, D.C. 20234 George A. Uriano, Chief

April 16, 1981 (over) Office of Standard Reference Materials

17
100

SECOND SURFACE

ALUMINUM MIRROR

(QUARTZ WINDOW)

250 1000 1500 2000 2500

WAVELENGTH (nm)

18
Table 1

Second Surface Mirror No. 124

(6° Incidence)

Wavelength Reflectance

(nn)

250 0.895

300 .891

150 80?

£00 -893

450 .887

.884

878

Ann 87/

.867

650 .863

700 .852

750 .833

800 .805

850 .800

900 .8^6.

1000 .010

1060 .027,

1100 .93?.

1200 .942

1300 .046

1500 .052

1750 .055

2000 .053

2250 .870

2 500 .897

19
Table 2 The spectral reflectance of a typical second surface mirror as a function of wavelength, angle of incidence, and

polarization.

(These values are not certified)

Wavelength and Parallel(p) Perpendicular(s) Unpolarized

Angle of Incidence Polarized Polarized (Ordinar

250 nm

6° 0.881 0.882 0.8815

30° .872 .886 .879

45° .862 .889 .8755

300 nm

6° .897 .897 .897

30° .889 .902 .8955

45° .880 .908 .894

400 nm

6° .895 .896 .8955

30° .888 .902 .895

45° .880 .908 .894

600 nm

6° .874 .876 .875

30° .868 .884 .876

45° .858 .892 .875

800 nm

6

3 .808 .810 .809

30° .797 .820 .8085

45° .782 .833 .8075

1000 nm

6° .910 .91

1

.9105

30° .908 .918 .913

45° .902 .924 .913

1500 nm

6° .952 .953 .9525

30° .953 958 .9555

4^° . 7 J I 9565

2000 nm

6° .954 .955 9545

30° .956 .961 .9585

45° .955 .964 .9595

2500 nm

6° .920 .918 .919

30° .921 .929 .925 45° .918 .927 .9225

SRM 2023

20
1 gur«*or3undards

19 Ambler. Director

Standard Reference Material 2024

Second Surface Aluminum Mirror

for Specular Reflectance from

250 to 2500 nm

V. R. Weidner and J. J. Hsia

lis Standard Reference Material (SRM) is intended for use in calibrating the photometric scale of specular reflectoeters. SRM 2024 is 2.5 x 10.1 cm in size. The aluminum mirror is vacuum deposited on the surface of a 2-mm thick

sed-quartz plate. This mirror is protected by a second fused-quartz plate attached to the first plate with epoxy cement.

le specular reflectance of the mirror was measured at 50-nm intervals from 250 nm to 900 nm, at 1 00-nm intervals from

K) nm to 1300 nm; and at 250-nm intervals from 1500 nm to 2500 nm. In addition to these wavelengths, the reflectance

as also measured at the laser wavelengths 632.8 nm and 1060 nm.

le certified values were determined in the following way: The reflectance of a master mirror was measured at the above

ecified wavelengths with a highly accurate specular reflectometer-spectrophotometer at angles of incidence of 6° , 30°

,

id 45°. These measurements were made for both vertically and horizontally polarized incident beams. The overall

tcertainty of these measurements is ±0.2 percent. The specular reflectance of the SRM second surface mirror was

easured relative to the master mirror on a high-precision reflectometer for 6° incidence only. The certified values of

ecular reflectance for the SRM mirror is based on the average value of the vertical and horizontal polarizations for the

aster mirror at 6° incidence. The certified values listed in Table 1 are assigned an uncertainty of ± 0. 005. The uncertified

ta listed in Table 2 indicate the variation in the specular reflectance of a typical second surface SRM mirror as a

nction of angle of incidence and plane of polarization. Figure 1 shows the spectral distribution of a typical second

rface aluminum mirror. The wavelength scale of this plot is greatly compressed and the reflectance scale expanded to lphasize the absorption features. Note that the absorption band at 800 nm is an inherent characteristic of aluminum

rrors. The small absorption bands near 1400 nm and 2200 nm are absorption features of the fused-quartz plate that

otects the aluminum coating.

LM 2024 can be cleaned by wiping the quartz first surface of the mirror with a soft tissue and isopropyl alcohol followed a rinse with distilled water.

e research and development of this SRM was supported by the DoE Solar Thermal Program through the Solar

tergy Research Institute. The calibration and certification were done by the Spectrophotometry Group of the

idiometric Physics Division. The overall direction and coordination of the preparation and technical measurements

ding to the certification were performed under the chairmanship of J. C. Richmond.

[e technical and support aspects involved in the certification and issuance of this SRM were coordinated through the

fice of Standard Reference Materials by R. K. Kirby.

ashington, D.C. 20234 George A. Uriano, Chief

ml 16, 1981 (over) Office of Standard Reference Materials

21
SECOND SURFACE

ALUMINUM MIRROR

(QUARTZ WINDOW)

250 1000 1500 2000 2500

WAVELENGTH (nm)

22
Table 1

Second Surface Mirror No. 2°

(6° Incidence)

Wavelength Reflectance

( nrrO

250 O.BfiO

300 .894

350 .894

£00 .893

450 • 88v

500 .885

550 .879

600 . 873

632.8 . 86^

650 .86(3

700 .353

750 .834

800 . 807

850 .801

900 .847

1000 .911

1060 .926

1100 .933

1200 .'''42 1300 • 0 ' 7

1500 .952

1750 .955

2000 .954

2250 .80"

2 500 .91.1

23
Table 2

The spectral reflectance of a typical second surface mirror as a function of wavelength, angle of incidence, and

polarization.

(These values are not certified)

Wavelength and Parallel(p) Perpendiculars) Unpolariz

Anele of Incidence r oianzea Polarized ^orainar

250 nm

6° 0.881 0.882 0.8815

30° .872 .886 .879

A <0 .OOZ 87^

300 nm

6° .897 .897 .897

30° .889 .902 .8955

4J .ooU Ran ono 804

400 nm

6° .895 .896 .8955

30° .888 .902 .895

A <0 .ooU 804

600 nm

6° .874 .876 .875

30° .868 .884 .876

45° .858 .892 .875

800 nm

6° .808 .810 .809

30° .797 .820 .8085

45° .782 .833 .8075

1000 nm

6° .910 .911 .9105

30° .908 .918 .913

45° .902 .924 .913

1500 nm

6° .952 .953 .9525

30° .953 .958 .9555

45° .951 .962 .9565

2000 nm

6° .954 .955 9545

30° .956 .961 .9585

45° .955 .964 .9595

2500 nm

•6° .920 .918 .919

30° .921 .929 .925

45° .918 .927 .9225

SRM 2024

24
(Eerttfttaie

Standard Reference Material 2025

Second Surface Aluminum Mirror with Wedge

for Specular Reflectance from

250 to 2500 nm

V.R. Weidner and J.J. Hsia

lis Standard Reference Material (SRM) is intended for use in calibrating the photometric scale of specular refiectoeters. The aluminum mirror has been vacuum deposited on the back surface of a 2-mm thick optical quality vitreous

jartz plate that has a wedge of 10 mrad (0.573°) between its long faces. This mirror is#rotected by a second vitreous

jartz plate with a similar wedge that is cemented to the first plate in such a way that the front and back surfaces of the

irror are parallel to 10 nm.

'hen a collimated beam is incident to the first surface at —6°, beams are reflected at 6°. ~7.6°, ~9.3°, ~ 1 1.0°, etc. ssentially all of the reflected flux is contained in the first four beams. The angle of reflection is a function of both the

edge angle and its dispersion (which is a function of wavelength). Calibration of photometers can be accomplished by

iing any of the individual beams or by using the total reflectance. Only the first reflected beam and the total reflectance,

jwever, are certified.

he specular spectral reflectance of a master second-surface mirror was measured at 25 wavelengths with a high-accuracy

'ecular spectral reflectometer at 6° incidence. The first surface reflectance, pi, of an uncoated plate was also measured

ith the same instrument at 6

3 incidence, with a detector that received only the beam reflected from the first surface. As

e plate that was used for this SRM was cut from the same piece of optical quality vitreous quartz (and had identical

Dlish ing treatment) as the uncoated plate, it is assumed that the reflectance from the first surface is the same, within the

icertainty of the certified value. The 6°-hemispherical reflectance of this SRM was compared to that of the master

andard at the same 25 wavelenghts with a high-precision integrating sphere reflectometer. The measured reflectance

tio was multiplied by the known reflectance of the standard at each wavelength to obtain the pt spectral data reported in ible 1. The overall uncertainty of these measurements is ± 0.5 percent.

ic Figure shows the spectral distribution of a typical second surface aluminum mirror. The wavelength scale of this plot

greatly compressed and the reflectance scale expanded to emphasize the absorption features. Note that the absorption

ind at 800 nm is an inherent characteristic of aluminum mirrors.

3.M 2025 can be cleaned by wiping the quartz first surface of the mirror with a soft tissue and isopropyl alcohol

llowed by a rinse with distilled water.

ie calibration and certification were done by the Spectrophotometry Group of the Radiometric Physics Division. The

'erall direction and coordination of the preparation and technical measurements leading to the certification were

;rformed under the chairmanship of J.C. Richmond.

ic technical and support aspects involved in the certification and issuance of this SRM were coordinated through the

ffice of Standard Reference Materials by R.K. Kirby.

George A. Uriano, Chief

Office of Standard Reference Materials

(over)

25

|5caHary

.

[3ur«» ofSundards

Ambtef. Director

ashington, D.C. 20234

:bruarv 23, 1982
These values are given in Table 2. The angles of reflection for the first four beams reflected from the SRM were computed for each wavelength from the

index of refraction. The plane of incidence is taken as a plane normal to the surface and parallel to the long sides of the

mirror. All angles between normal and the thin end of the wedge are negative, and those between normal and the thick

end arc positive.

The direction ti\ of the first beam, with reflectance pi, is 6° since there is no refraction. The directions of the other three

beams are:

6z = sin

1 jn sin[2a + sin1 (-jj-sin 6°)]^

03 = sin

1 jn sin[4a + sin

1 (-ppsin 6°)]}

04 = sin

1 jn sin[6a + sin

1 (-jj- sin 6°)]}

where a = 0.573°.

These directions for each wavelength are given in Table 2. Note that the angle of reflection is a function of both the wedge effect of the plate and its dispersion. The wedge effect is independent of wavelength. The dispersion angle changes with wavelength because the index of refraction of the plate

changes with wavelength. If the wedge standards are used to calibrate a specular spectral reflectometer at different wavelengths, using beam 2 reflected once from the second-surface aluminum coating, the dispersion effect may make it necessary or desirable to shift the optical path slightly when changing wavelength. If spectrally total reflectance measure- ments are made, there will be a slight spread (about 0. 1° for beam 2, 0.2° for beam 3 and about 0.35° for beam 4) in the

reflected beam, due to the dispersion of the plate and a slightly larger detector may be required for spectrally total measurements than for spectral measurements.

Because pratically all of the flux reflected from the wedge is contained in the first four beams, the total specular

reflectance, pt, can be approximated in terms of the reflectance of the first surface, pi, the transmittance of the quartz

surface, r = l-pi, and the reflectance of the aluminum surface, ps, as

2 2 2 2

1 3 Pt = pi + ri "ps + T\ "pips* + n pi "Ps Using the measured values of pt and pi, the values of p:, p3, and pa can be calculated as

P2 = n -pi

2

•» P3 = ri"pi-p,~

2 2 1 P-s = *] 'PI 'Ps

Pt ~ PI where ps = ; rf+ pi (pt-pi)

The computed values for pi, pi, and pa are given in Table 3.

These equations were derived on the basis of two assumptions; ( 1) that there is no internal absorptance in the vitreous

quartz (there is some slight absorptance at 250 nm, but essentially none at 300 nm and above); and (2) that the values of

r up i and p% are independent of the direction of incidence over the range of angles of incidence involved. This is essentially true for angles of incidence of less than 15°. The computed reflectance for a material with index of refraction

of 1 . 5 is 0.040000 at normal incidence, 0.040002 at 6° incidence and 0.04008 1 at 1 5° incidence. The fractional error due to the assumption that the reflectance is independent of the angle of incidence is thus well within the uncertainty of the

measured values.

26
Table 1

Total Specular Spectral Reflectance (f^.), for 6 Incidence,

and First Surface Reflectance (p^) of Fused Quartz Plate

Mirror No. 107W

Wavelength

(nm) (pt ) (px

)

250 0.869 0.0406

300 .394 .0379

350 .895 .0364

400 .893 • 0355

450 .888 .0350

500 .884 .0347

550 .378 .0344

600 .874 .0342

632.8 .868 .0342

650 .865 .0342

700 .853 .0339

750 .335 .0338

800 .807 .0337

850 .800 .0335

900 .847 .0334

1000 .911 .0333

1060 .925 .0332

1100 .932 .0332

1200 .942 .0330

1300 .947 .0328

1500 .952 .0325

1750 .955 .0321

2000 .955 .0317

2250 .951 .0313

2500 .949 .0310

27
TABLE 2

Index of Refraction, n, of Cover Plate and Direction,

in Degree from Normal, of First Four Reflected Beams

(These Values Are Not Certified)

Wavelength Index of ©I 6: 63 04

nm Refraction deg. dee. deg. deg.

250 1.5047 6.000 7.731 9.466 11.207

inn A AAA 1 *7A"7 Q A 1 1 1 1. 1 jZ

350 1.4715 6.000 7.693 9.389 11.090

400 1.4643 6.000 7.684 9.372 1 1.065

450 1.4603 6.000 7.680 9.363 11.051

500 1.4578 6.000 7.677 9.357 11.042

1 A < ZA t. AAA O.IXJU /.0/4 1 1.UJ4

600 1.4538 6.000 7.672 9.348 11.028

632.8 1.4538 6.000 7.672 9.348 1 1.028

650 1.4538 6.000 7.672 9.348 1 1.028

700 1.4513 6.000 7.669 9.342 11.019

750 1.4505 6.000 7.668 9.340 11.017

800 1.4497 6.000 7.668 9.338 11.014

850 1.4481 6.000 7.666 9.335 11.008

900 1.4473 6.000 7.665 9.333 11.005

1000 1.4464 6.000 7.664 9.331 11.002

1060 1.4456 6.000 7.663 9.329 10.999

1100 1.4456 6.000 7.663 9.329 10.999

1200 1.4440 6.000 7.661 9.325 10.994

1300 1.4423 6.000 7.659 9.321 10.988

1500 t.4399 6.000 7.656 9.316 10.979

1750 1.4365 6.000 7.652 9.308 10.968

2000 1.4322 6.000 7.648 9.300 10.956

2250 1.4299 6.000 7.645 9.292 10.944

2500 1.4274 6.000 7.642 9.287 10.935

28
Table 3

Reflectances P2 » and ^4

Reflected by the Wedge Mirrors, Computed from the Measured First

Surface Reflectance of the Plate and the Total Specular Spectral

Reflectance for a Collimated Beam Incident at -6°

(THESE VALUES ARE NOT CERTIFIED)

Mirror No. 107.'/

Wavelength

(nm) (P2 ) (p3 ) (fij)

250

300

350

400

450

500

550

600

632.8

650

700

750

800

850

900

1000

1060

1100

1200

1300

1500

1750

2000

2250

2500

0.7992

.8271

.8306

.8303

.8265

.8233

.8181

.8147

.8091

.8062

.7954

.7786

.7523

.7460

.7906

.8511

.8644

.8710

.8807

.8858

.8911

.8946

.8954

.8923

.8911

0.0282

.0280

.0270

.0263

.0257

.0252

.0247

.0243

.0240

.0238

.0230

.0219

.0204

.0200

.0223

.0258

.0265

.0269

.0274

.0275

.0276

.0274

.0271

.0266

.0262

0.0010

.0009

.0009

.0008

.0008

.0008

.0007

.0007

.0007

.0007

.0007

.0006

.0006

.0005

.0006

.0003

.0008

.0003

.0009

.0009

.0009

.0008

.0008

.0008

.0008

29
100

SECOND SURFACE

ALUMINUM MIRROR

(QUARTZ WEDGE WINDOW)

1000 1500

WAVELENGTH (nm)

30
References

1. Bennett, H.E. and Porteus, J.O., Relation Between Surface Roughness

and Specular Reflectance at Normal Incidence, Jour. Opt. Soc. Am.,

51, [2] 123-125 (1961).

2. Hass, G., Filmed Surfaces for Reflecting Optics, Jour. Opt. Soc.

Am., 45, [11] 945-952 (1955).

3. Hass, G. and Waylonis, J.E., Optical Constants and Reflectance

and Transmittance of Evaporated Aluminum in the Visible and

Infrared, Jour. Opt. Soc. Am., 51 [7] 719-722 (1961).

4. Bennett, H.E., Bennett, J.M. and Ashley, E.J., Infrared Reflectance

of Evaporated Aluminum Films, Jour. Opt. Soc. Am., 5_2 [11] 124 5-

1250 (1960),

5. Bennett, H.E., Silver, M. and Ashley, E. J. , Infrared Reflectance

of Aluminum Evaporated in Ultra-High Vacuum, Jour. Opt. Soc. Am.,

53 [9] 1089-1095 (1963).

6. Weidner, V.R. and Hsia, J.J., NBS Specular Ref lectometer-Spectrophotometer, Appl. Opt., 19 [8] 1268-1273 (1980).

7. Venable, William H. Jr., Hsia, Jack J., and Weidner, Victor R.

,

Development of an NBS reference spectrophotometer for diffuse

reflectance and transmittance, Natl. Bur. Stand. (U.S.), Tech.

Note 594-11; 1976 October, 47p.

31 ir U.S. GOVERNMENT PRINTING CfHCE : 1982 O—390-997 (2269)

U.S. DEPT. OF COMM. I. PUBLICATION OR 2. Performing Organ. Report No. 3. Publication Date BIBLIOGRAPHIC DATA

REPORT NO.

SHEET (See instructions) NBS SP 260-79 October 1982

4. TITLE AND SUBTITLE

Standard Reference Materials:

Second-Surface Mirror Standards of Spectral Specular Reflectance [SRM's 2023,

2024, 2025]

5. AUTHOR(S)

Joseph C. Richmond, Jack J. Hsia, Victor R. Weidner and David B. Wilmering

6. PERFORMING ORGANIZATION (If joint or other than NBS. see instructions)

NATIONAL BUREAU OF STANDARDS

DEPARTMENT OF COMMERCE

WASHINGTON, D.C. 20234

7. Contract/Grant No.

8. Type of Report £< Period Covered

Final

9. SPONSORING ORGANIZATION NAME AND COMPLETE ADDRESS (Street. City. State. ZIP)

This work was funded by the U.S. Department of Energy, through the Solar Energy

Research Institute, Golden, Colorado.

10. SUPPLEMENTARY NOTES

Library of Congress Catalog Card Number: 82-600615

FJTM] Document describes a computer program; SF-185, FlPS Software Summary, is attached.

11. ABSTRACT (A 200-word or less factual summary of most si gnificant information. If document includes a significant

bibliography or literature survey, mention it here)

NBS was requested by the Department of Energy to prepare, calibrate and

disseminate standards of spectral specular reflectance for use in calibrating

ref lectometers used to evaluate the solar specular reflectance of concentrating

mirrors used in solar energy systems.

The mirror chosen was a second-surface mirror of vacuum-deposited aluminum

on optically polished vitreous quartz backed up with a second plate of ground

and polished vitreous quartz cemented to the back of the mirror. Standards were

prepared in two sizes, 51 x 51 mm, and 25 x 101 mm.

The cost of developing and calibrating the standards was included in a contract issued by the Solar Energy Research Institute of Golden, Colorado,

which is financed by the Department of Energy.

12. KEY WORDS (Six to twelve entries; alphabetical order; capitalize only proper names; and separate key words by semicolon s) aluminum mirrors; directional specular reflectance; reflectance specular;

reflectance standards; second surface mirrors; solar reflectance; specular

spectral reflectance.

13. AVAILABILITY

fjT"] Unlimited

|

| For Official Distribution. Do Not Release to NTIS

fX"] Order From Superintendent of Documents, U.S. Government Printing Office, Washington, D.C.

' 20402. Tj Order From National Technical Information Service (NTIS), Springfield, VA. 22161

14. NO. OF

PRINTED PAGES

41

15. Price

$4.50

jSCOMM-OC 8043-PSO