'^liiiiiiiS PUBLICATIONS

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Standards and Technology

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NIST Special Publication 250-90

Calibration Uncertainty for the NIST

PM/AM Noise Standards

Archita Hati

Craig Nelson

Neil Ashby

David Howe

' 100

.U57

# 250-90

2012

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NIST Special Publication 250-90

Calibration Uncertainty for the NIST

PM/AM Noise Standards

Archita Hati

Craig Nelson

Neil Ashby

David Howe

Time and Frequency Division

Physical Measurement Laboratory

National Institute ofStandards and Technology

325 Broadway

Boulder. Colorado 80305

July 2012

U.S. Department of Commerce

Rebecca Blank, Acting Secretary

National Institute of Standards and Technology

Patrick Gallaher, Director
Certain commercial entities, equipment, or materials may be identified in this document in order to describe an experimental procedure or concept adequately. Such

identification is not intended to imply recommendation or endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the

entities, materials, or equipment are necessarily the best available for the purpose.

National Institute of Standards and Teciinology Special Publication 250-90

Natl. Inst. Stand. Technol. Spec. Publ. 250-90, 44 pages (July 2012)

CODEN: NSPUE2

U.S. GOVERNMENT PRINTING OFFICE

WASHINGTON: 2001

For sale by the Superintendent of Documents, U.S. Government Printing Office

Internet: bookstore.gpo.gov — Phone: (202) 512-1800 — Fax: (202) 512-2250

Mail: Stop SSOP, Washington, DC 20402-0001
Contents

1 Introduction 1

2 AM and PM noise - Basic concepts 2

2. 1 Characterization of AM and PM noise 2

2.2 Overview of amplitude, phase and single sideband modulation 3

2.2. 1 Amplitude modulation 3

2.2.2 Phase modulation 3

2.2.3 Single-sideband modulation 5

3 Description of the noise standard 7

4 Measurement setup for calibration of the PM/AM noise standard 9

5 Calibration procedure at NIST 10

5. 1 Measurement of the carrier power via down-conversion from the upper sideband 10

5.2 Measurement of the carrier power via down-conversion from the lower sideband 10

5.3 Measurement of the noise power spectral density down-converted from both the

upper and the lower sidebands 11

5.4 Measurement of the noise floor power spectral density 12

6 Measurement equation 13

7 Estimation of uncertainty 15

8 Uncertainty budget 18

9 Validation of the measurement 20

10 Acknowledgement 20

Appendix A Verification of the baseband measurement equation 21

Appendix B Measurement of correction factors, K^l, Krf, Kbw and Kp 25

Appendix C Error of signal power measurements in the presence of background noise 28

REFERENCES 31

iii
Notations

Acronym Meaning

AM Amplitude Modulation

BPF Bandpass Filter

BW Bandwidth

dB Decibel

dBm Decibel relative to 1 milliwatt

DDPNMS Direct Digital Phase Noise Measurement System

FFT Fast Fourier Transform

IF Intermediate Frequency

LO Local Oscillator ' LPF Low-Pass Filter

LSB Lower Sideband

PDLMS Photonic Delay Line Measurement System

PM Phase Modulation

PSD Power Spectral Density

rf Radio Frequency

RF Reference Frequency

SNR Signal-to-Noise Power Ratio

SSB Single Sideband

USB Upper Sideband

VSWR Voltage Standing-Wave Ratio

Symbol Meaning

o(t) Instantaneous amplitude fluctuations

Phase modulation index

Maximum error of Knl from unity

Maximum error of Krf from unity

£fi Correction factor due to the small angle modulation approximation

(/)(t) Instantaneous phase fluctuations

^(ppeak Peak phase deviation

A0rms Root-mean-square phase deviation

7 Noise power in 1 Hz bandwidth

Vo Carrier frequency

Vlo Carrier frequency at the LO port of the mixer

Vrf Carrier frequency at the RF port of the mixer

<7fj Fractional uncertainty due to the small angle modulation approximation

(TBear- Fractional uncertainty in the lower-sideband beat measurement

Fractional uncertainty in the upper-sideband beat measurement

(^B-FFTAve Uncertainty due to the number of FFT averages for beat measurement

(Tbw Fractional uncertainty in the estimated measurement bandwidth for the power

iv
spectral density function

<5c Combined fractional uncertainty

ctlr Uncertainty due the long-term reproducibility of the PM/AM noise standard

between calibration cycles

(^N-FFTAve Uncertainty due to the number of FFT averages for noise measurement

CfNL Fractional uncertainty due to the FFT analyzer and mixer nonlinearity at baseband

(^NoiseOn Fractional uncertainty in the noise measurement with the noise source on

Orf Fractional uncertainty due to the frequency response of the down-convertor

(includes offset signal generator and mixer) at rf

(^SR Uncertainty due to the short-term repeatability between measurements

Oh Angular frequency of the carrier signal

rn Angular modulation freouencv

BWa ^ f .1 Actual il.V' Artiij^l ILJ-Cll hanHwiHth \J iXxWX VV lU-Lli

'

' est Estimated bandwidth

J Fourier or offset freouencv

Lower frequency limit of the integrated phase noise

T Innpr frpniipnrv limit of thp intpprafpH nhasp noisp

rrain VJCilll ofWl thp lliw Hown-ronvprtpr VJv-' VV 11 ^Wll V wl Lwl fit Cll thp tllw hasphPinH L/ClowU/ClllU SRF frain VJCllll ofv^l thp lliw Hown-pon W 11 Wll vprtpr V 1^1 MtiXv ILO its two Vy\ \J onpratinp W lywl Cll. Ill £l frpniipnpips 1 1 V^vl Ll^llV^ i^O^ Vnc ' anrl Vi/-v Kr t^A'vl V ]^(_) gVSWR Gain of the down-converter due to VSWR mismatch

gLVL Gain of the down-converter for a specific power level at the RF port

G Gain of the down-converter

Jn n-th order Bessel function

k Coverage factor

Kp Correction factor applied to £(f) due to the small angle modulation approximation

Kbw Correction factor for incorrect estimation of the actual measurement bandwidth

for the power spectral density function

Correction factor due to the FFT analyzer and mixer nonlinearity at baseband

Krf Correction factor due to the frequency response of the down-convertor (includes

offset signal generator and mixer) at radio frequencies

m Single sideband phase noise equal to one half of if)

tn Amplitude modulation index

iMUlllUCI Ui IcpCdLcU lllCaSUrcillCIll aCLS 111 d glVCIl CallDrdlUjn

i^UlllUC'l \JV 111 dVCld^Co \.\jV UCCIL lliCd^Ul ClliClll

Noise l>IUillUCl yjV JTIT^ 1 aVClagCJ^ lUl llVJlwiC lliCdc>UlCillCilL n T-Ti CTnPf-r^fHpf tPTTTic c\\ TTd^/lr^T* PYt^cincir^n riigiici ulU-ci Lciiii^ ui 1 ayiui CAUdii?>iuii

p

^pearner Powpr IpvpI at thp RP nort of thp mixpr HiiHncr rarripr nowpr mp?i<iiirpmptit

Carrier power after down-conversion to baseband

P . H01S€ Power level at the RF port of the mixer during the noise measurement

PN-Beat Noise power after down-conversion to baseband

PSSB-AM Single-sideband AM signal power

PsSB-PM Single-sideband PM signal power

Sa(f) One-sided double-sideband power spectral density of amplitude fluctuations

One-sided double-sideband power spectral density of random phase fluctuations

V
uc Combined uncorrelated uncertainty

U Expanded uncertainty

Y(t) Instantaneous voltage fluctuations

Vb Peak voltage of the carrier signal

yBaseband Foldcd doublc-sideband down-converted voltage of the PM/AM noise standard at baseband

VBeat- Voltage of the lower-sideband beat frequency

yBeat+ Voltage of the upper-sideband beat frequency

VBeatAve Avcragc voltagc of the upper- and lower-sideband beats

VBeat-. M Mcasurcd voltage of the lower-sideband beat

yBeat+, M Mcasurcd voltage of the upper-sideband beat

VNoiseOff Voltage of the additive noise at baseband with noise source off

VNoiseOn Voltagc of the additive noise at baseband with noise source on

VNoiseOff. M Mcasurcd voltage of the additive noise at baseband with noise source off

VNoiseOn, M Mcasurcd voltage of the additive noise at baseband with noise source on

VpNST Signal voltage of the PM/AM noise standard at rf VpNST(CamerOn) Signal voltagc of thc noise standard when the additive noise is off and the carrier

is enabled

VpNST(NoiseOn) Signal voltage of the noise standard at baseband when the additive noise is enabled and the carrier is off

VssB Peak voltage of the single-sideband tone

vi
1 Introduction

In this document, we provide the total (or combined) uncertainty of phase modulation fPM) and

amplitude modulation (AM) noise measurement of the NIST portable noise standard calculated

from the individual measurement uncertainties. NIST provides an on-site calibration service

(77 BSC) of the accuracy of PM and AM noise and noise floor of the measurement systems at the customer's site by use of two separate portable PM/AM secondary noise standards [1]. One

noise standard is for carrier frequencies of 5 MHz, 10 MHz, and 100 MHz, designated as model

510100 [2], [3], and the other for carrier frequencies of 10.6 GHz, 21.2 GHz, and 42.4 GHz,

designated as model 102040 [4].

The PM and AM noise of the noise standard are usually measured twice at NIST, once before

sending it to the customer (the "out" measurement) and a second time after receiving it back (the

"in" measurement). The customer uses its PM/AM noise measurement system and measures the

calibrated noise level of the NIST secondary noise standard. Customer results are compared with

the average of the "in" and "out" measurements at NIST. If the results are within the

measurement uncertainty then the calibration is certified and a "PASS" calibration report is issued. When there is significant discrepancy in the results, the customer is advised to recheck

the measurement configuration and re-measure. If the customer results cannot be achieved

within the measurement uncertainty, a "FAIL" calibration report is then issued.

The purpose of this document is to describe the calibration uncertainty for the NIST PM/AM

noise standard. The document is organized as follows. In Section 2, we first introduce the basic

concepts of AM and PM noise. We briefly discuss the characterization of AM and PM noise in

Sub-section 2.1, and an overview of different types of signal modulation is presented in Subsection 2.2. Section 3 describes the working principle of the PM/AM noise standard, and in

Section 4 the experimental set-up for calibrating the standard is presented. In Section 5 a

detailed step-by-step calibration procedure is provided. The measurement equation, a detailed

uncertainty calculation and the uncertainty budget for the noise standard are presented in

Sections 6, 7 and 8, respectively. Finally, in Section 9, a brief discussion for validating the

calibration results is presented. This document is supported by three appendices. Appendix A

provides verification that the baseband measurement equation is equal to the original definition

of single sideband (SSB) PM noise at the radio frequency (rf). Measurement of different

correction factors involved in the calibration of the noise standard is described in Appendix B.

Finally, Appendix C presents a calculation for the error of a signal power measurement in the

presence of background noise

1
2 AM and PM noise - Basic concepts

In this section we briefly describe the basic concept of phase-modulated (PM) noise and

amplitude-modulated (AM) noise and their characterization in the frequency domain [5-8]. We

also discuss the basic theory behind the PM/AM noise standard.

2.1 Characterization of AM and PM noise

In the real world, an oscillator outputs a signal that fluctuates in both amplitude and phase. This

signal can be mathematically represented by

vit) = V,[l + a{t)']cos[a),t + ^(t)'], (1)

where Vq is the peak amplitude, a(t) is the normalized instantaneous amplitude

fluctuation, co^ = Itwq is the angular frequency of the carrier, (jit) is the instantaneous phase

fluctuation, V,,,,^ is the root-mean-square (rms) voltage, and Vq is the carrier frequency.

In the frequency domain, the amplitude stability of a signal is characterized by the power spectral

density (PSD) of instantaneous amplitude fluctuations Sa (f)- given by

Sjf)=^, (2)

where ^cir(/)^'is the mean-square normalized amplitude fluctuation at an offset or Fourier

frequency /(O <f<oo) from the carrier and BW is the bandwidth of the measurement system.

The unit of Sa (/) is 1/Hz. Similarly, in the frequency domain, the phase instability of a signal is characterized by the PSD of instantaneous phase fluctuations (/), given by

where (a^,.„,^ (/)) is the mean-square phase fluctuation at an offset frequency/(0 </< <») from

the carrier frequency Vq. The unit of 5^ if) is rad"/Hz. Since / ranges from zero to infinity and

since both Sa if) and 5^ if) include the fluctuations from upper and lower sidebands of the carrier,

these two quantities are single-sided double-sideband units of measure.

The PM noise unit of measure recommended by the IEEE [5] is £{f), defined as

£{f)^^^. ,, (4)

2
£{f) includes the fluctuations from only one sideband of the carrier, and hence it is a singlesideband unit of measure. When !£{f) is expressed in the form 101og[/(/)], its unit is dBc/ Hz,

that is dB below the carrier in a 1 Hz bandwidth. The logarithm is computed to the base 10.

Also, when the integrated PM noise for offset frequencies 0 < /< cxd is less than 0.01 rad", /(/) can be viewed as the ratio of phase noise power per unit bandwidth in a single sideband to power

in the carrier [See later Eq.(12)].

2.2 Overview of amplitude, phase and single sideband modulation

Before we discuss the working principle of the NIST PM/AM noise standard, it is worthwhile to briefly discuss different types of signal modulation.

2.2.1 Amplitude modulation

In amplitude modulation, the carrier amplitude varies with the modulating baseband signal while

the frequency and phase are not modulated. The simplest AM signal is produced when the

modulating signal is a sinusoid at frequency co,n [9], [10]. The resultant modulated signal also

called single-tone AM, is given by

(r ) = [1 + m cos COj] cos 0)^t

(5)

where m is the amplitude modulation index. The two sidebands are symmetrical about the carrier

frequency and are equal in magnitude. The ratio of SSB AM power {Pssb-am) to carrier power

{Pc) is

4

For AM, the resultant vector sum of the sidebands is always in phase with the carrier (Figure 1).

2.2.2 Phase modulation

In the case of phase modulation, the modulating signal leaves the amplitude of the carrier

unchanged. Instead, the phase of the carrier varies with the modulating signal [9], [10]. A singletone PM signal can be represented by

V [t) = VQCos[coQt + P sin coj]

3
where P is the phase-modulation index (or peak phase deviation, also denoted by Aippeak)- The

second exponential term in the curly bracket is a periodic signal with period lTdcOm and can be

expanded by the exponential Fourier series

(8)

JniP) is the - order Bessel function of the first kind [11]. For small modulation index (/?«

1),

(9)

\n\ > 1.

Also, from symmetry, J-niJ^ =(-1)" JniP)'-, therefore, Eq. (7) becomes

(10)

This resembles the AM case in Eq. (5), except that in PM, the phase of the lower sideband is reversed, and the resultant vector sum of the sidebands is always in phase quadrature with the

carrier (Figure 1).

Further, the ratio of SSB PM power {Pssb-pm ) to carrier power is

(11)

As mentioned in Section 2.1, when the integrated PM noise for offset frequencies 0 </< <» is less than 0.01 rad", U^(f) can be viewed as the ratio of phase-noise power in a single sideband to

the carrier power. This can also be shown analytically by use of Eqs. (3), (4) and (11), as follows:

SU-PM if)

^ ' 2 ' 2BW 4BW \ P^

(12)

BW=lHz

when

4
^2js,(/)d/«0.1 rad^,,,. (13)

However, the practical values for the lower and upper integration limits, fi and fu, are respectively the reciprocal of the measurement time and system half-bandwidth.

The condition of Eq. (13) follows by defining a higher order correction, , as a normalized

departure of Eq. (11) from the small angle modulation approximation given by

(14)

Then the error (^^^ -1) in X{f) for 0. 1 is 0.3% (0.01 dB) or less.

2.2.3 Single-sideband modulation

In this Section, we discuss briefly single-sideband modulation, as this is necessary to explain the

working principle of the PM/AM noise standard. A single-tone upper SSB signal is represented

by

V (

r

) = cos 6^0? + y,,^ cos (CO,, + ) t

1 +

(15)

V,Re

AM PM

where Vssb is the peak voltage of the single-sideband tone at (ftb+ (t^n)- Now comparing Eq. (15)

with (5) and (10), the second term within the square bracket represents AM, and the last term

represents PM. Therefore, the SSB signal can be envisioned as a combination of four signals of

equal amplitude; two of them consist of pure AM, and the other two consist of pure PM. For a SSB signal, half of the power is present in AM and other half is present in PM. Eq. (15) can also

be explained in other words as follows: the two lower sideband terms (^""'') are 180 out of

phase, and thus cancel, and the upper sideband terms ) are in phase, and thus add

coherently, resulting in a SSB modulation.

Now if instead of a single tone, there is additive white noise, the theory of single-tone SSB

modulation can still be applied [12], [13]. Consider an upper noise sideband at "Vo+ /" with

associated noise power ;^ in 1 Hz bandwidth. It will produce upper and lower PM and AM noise

5
2 sidebands, each having average power y /4. If there is a similar amount of uncorrelated white

noise power in the lower sideband at "Vq-/", it also will produce four signals, two AM and two

PM of average power y^lA. The contribution from the lower and upper sidebands produce on

average equal amounts of PM and AM noise; however, the phase difference between them varies

randomly with time.

Figure 1. Phasor diagrams of the amplitude, phase and SSB modulation. LSB is the lower

sideband and USB is the upper sideband. The gray vector indicates the resultant of the carrier

and sidebands.
3 Description of the noise standard

The block diagram of the noise standard at 5 MHz, 10 MHz, and 100 MHz is shown in Figure 2. The detailed description of this noise standard can be found in [2]. The noise standard has two

outputs, one clean unmodulated reference and another modulated. The powers of the two output

signals are approximately +15 dBm for each carrier frequency.

5 MHz

10 MHz

5 MHz

0.

2X

Carrier

Off

Power

Divider

Phase

Shifter _^ +18 dBm

T

Reference

On

100 MHz

Coupler +15

Modulated

External

Input f

Noise Off

50 ii

5 MHz BPF

1-900 MHz

Noise Source 10 MHz BPF

100 MHz BPF

Figure 2. Block diagram of 510100 PM/AM noise standard, which selects one of three

frequencies of 5 MHz, 10 MHz, and 100 MHz. BPF is the bandpass filter

A calibrated level of bandpass-limited Gaussian noise is added to the "Modulated Output" of the

standard to create equal levels of PM and AM noise. The level of added noise is selected such

that it satisfies Eq. (13), and is at least 40 dB above the noise floor of most measurement

systems. This calibrated noise level is typically constant in magnitude to better than ± 0.5 dB for

Fourier frequencies from dc to 10 % of the carrier frequency. For the 5 MHz standard, the

calibrated noise level is approximately -110 dBc/Hz with a 3.5 MHz bandwidth. The residual

PM and AM noise between these two outputs is exceptionally low [2]. Typically, the differential

PM noise between the two output signals is less than -190 dBc/Hz for Fourier offsets of 10 kHz

and above.

7
The modulated output has precisely equal PM and AM noise, since there is no phase coherence

between the signal and the noise, as described in 2.2.3 and [12]. The power spectral density

(PSD) of the SSB PM noise, [/(/)], and AM noise, [1/2 Sa(/)], generated by the noise standard is given by

1 P^D[Noise (K,-/)] 4- P5D[Noise ( Vq+D]

^[f)=-Sa[f)= An ' ^^^^ 2 4 Carrier Power

when Eq. (13) is satisfied [2]. One factor of two in the denominator arises because half of the

additive noise power appears as PM and half as AM. The other factor of 2 is due to the equal

distribution of noise power between the upper and lower sidebands.

^(f ) is constant with frequency from dc to approximately the half-bandwidth of the filter,

assuming that the added noise is constant in amplitude from Vq -/ to Vq +/.

8
4 Measurement setup for calibration of the PM/AM noise standard

To measure ^{f) at multiple offset frequencies, /, a digital fast Fourier transform (FFT)

spectrum analyzer is used to take advantage of its speed, high dynamic range and flexibility in

measurement bandwidth. To measure beyond the upper frequency capability of the FFT, a heterodyne down-converter is used to convert the output of the PM/AM noise standard to an

intermediate frequency (EF) that can be conveniently measured by the FFT analyzer.

AM/PM Noise

Calibration

Standard

Offset

Signal

Generator

+10 dBm

Ref. AMr>

50 Q

Mod.

-33 dB

i—WV—

- RF

Double

Balanced

Mixer

+-vy/\H- LoT "-PF

Optional

Amp

Spectrum

Analyzer

-3 dB

Figure 3. Block diagram of a heterodyne measurement system used to calibrate the 510100

PM/AM noise standard

The block diagram of the heterodyne down-converter used to calibrate a PM/AM noise standard

at NIST is shown in Figure 3. It is composed of a double-balanced mixer (LO level +7 dBm), an

offset signal generator, and a low-pass filter (LPF). The modulated port of the noise standard is connected to the reference frequency (RF) mixer port via a large attenuator. The large attenuator

at the RF port ensures that the signal from the PM/AM noise standard is far below the saturation

point of the mixer and that it is operating as a linear frequency down-converter. The small

attenuators on the local oscillator (LO) and IF ports are used to stabilize the impedance of the

mixer. A LPF is used after the mixer to reject the sum of the two mixed frequencies and pass the

difference signal.

9
5 Calibration procedure at NIST

The offset generator and the PM/AM noise standard are turned on and allowed to stabilize for at least 24 hours. The offset signal generator is connected to the LO port of the down-converter

and adjusted to +10 dBm. If possible, the offset generator and the PM/AM standard are also

locked to a common frequency reference. The reference port of the PM/AM noise standard is terminated with 50 Q, and the modulated output port is connected to the highly attenuated RF

port of the down-converter. The noise and the carrier of the PM/AM noise standard can be

independently enabled. This allows the carrier and the noise to be independently characterized,

utilizing the full dynamic range of the FFT device.

A typical calibration consists of a set of individual calibration points at different offset

frequencies from the carrier. This set of offset frequencies is typically logarithmically spaced, 3

to 5 points per decade, spanning from 1 Hz to 10 MHz or a maximum of 10 % of the carrier

frequency. For each offset frequency, /, in the calibration set, four measurements are made and

used to calculate the phase noise generated at that offset frequency. These four measurement

steps are graphically shown in Figure 4 and described in the following four sub-sections.

5.1 Measurement of the carrier power via down-conversion from the upper

sideband

The carrier power of the PM/AM standard is turned ON and the noise is turned OFF. The

frequency of the offset generator is set to Vo+/ The carrier at Vq from the PM/AM standard and

the signal from the offset generator at Vo+ /are mixed in the down-converter creating a baseband

beat at frequency /. The power in the baseband signal at / will be proportional to the carrier

power of the PM/AM noise standard at Vq. The FFT analyzer range is set to auto to select the

maximum dynamic range, and a measurement of the signal power at / is made and recorded in

units of V^rms, Utilizing a Flattop window. Also a measurement of the signal-to-noise power ratio

(SNR) between the beat signal and the background noise is recorded. This measurement is graphically shown in Figure 4(a).

5.2 Measurement of the carrier power via down-conversion from the lower

sideband

Similar to the previous step, the carrier power of the PM/AM standard stays ON and the noise is OFF. The frequency of the offset generator is set to Vo - / The carrier at Vq from the PM/AM

standard and the signal from the offset generator at Vq - / are mixed in the down-converter,

creating a baseband beat at frequency / The power in the baseband signal at / will be

proportional to the carrier power of the PM/AM noise standard at Vq. The FFT analyzer is autoranged for maximum dynamic range, and a measurement of the signal power at / is made and

recorded in units of V^„K by use of a Flattop window. Also, a measurement of the signal-tonoise ratio (SNR) between the beat signal and the background noise is recorded. This

measurement is graphically shown in Figure 4(b).

10
5.3 Measurement of the noise power spectral density down-converted from

both the upper and the lower sidebands

The carrier power of the PM/AM standard is then turned OFF and the noise is turned ON. The

frequency of the offset generator is set to Vq. The double-sideband noise spectrum about Vo is down-converted to baseband by mixing with the offset generator at Vq. The PSD of the baseband

noise at/ is proportional to the PSD of the double-sideband noise of the PM/AM noise standard

about Vq. The FFT analyzer is auto-ranged for maximum dynamic range, and a measurement of

the down-converted PSD at / is made and recorded in units of V^nn/Hz, by use of a low-leakage

Manning window 114]. This measurement is graphically shown in Figure 4(c).

RF Signal Baseband

(a) 1

^0 %+f

* t I SNR A

I— ^ I /

(b)i

/

vLM)

(d)|

V,-f V, v,+f

Frequency [Hz]

I— I »

/

\ \

f

Offset Frequency [Hz]

Figure 4: This diagram graphically represents the four measurement steps involved in

calibrating the PM/AM noise standard. In (a) and (b), the down-converted signal power at 'f

' is proportional to the noise standard carrier power at Vq.

11
5.4 Measurement of the noise floor power spectral density

The carrier power of the PM/AM noise standard is turned OFF and the noise is turned OFF. The

frequency of the offset generator kept at Vq. Next, a noise floor measurement of the downconversion process is made. The FFT analyzer must NOT be auto-ranged, and the range setting

should be identical to that used in Section 5.3. Keeping the auto-range at the same level ensures

that the noise floor of the FFT analyzer is the same for measurements 5.3 and 5.4. The PSD at offset frequency / is measured in units of V\m.JHz, utilizing a Banning window. The PSD of the

noise floor at /will contain noise contributions from the down-converter components, such as the

mixer, IF amplifier, the noise of the offset generator, and the input noise of the FFT spectrum

analyzer. This measurement is graphically shown in Figure 4(d).

The measurement procedure described above is repeated at least three times for each carrier

frequency. All measurements are made with a single one-time connection to the measurement

system, and the same analyzer is used for all measurements. The absolute gain or frequency

response of the down-converter and the spectrum analyzer are unimportant, because they are canceled due to the ratiometric relationship between the measurement of the carrier power and

additive noise. This same characteristic also removes any inconsistency resulting from voltage

standing wave ratio (VSWR) mismatch or connector interface non-repeatability.

The noise-voltage data are combined with the beat-power measurements described above

according to the baseband measurement Eq. (18) to yield the relative power in either AM, 1/2

Sa(f), or PM noise.

12
6 Measurement equation

£{f) in Eq. (16) represents a ratio of power measurements performed at radio frequency (rf). A

higher order correction, AT//, due to the small angle modulation approximation is introduced and

Eq. (16) is rewritten as

£[f) = ls (f)=

^ ^^^[Noise(Vo-/)]+P5D[Noise(F,+/)]

2

" K„ 4 Carrier Power

(17)

The correction factor, Kp, is introduced only to propagate the error due to the approximation in

the measurement equation. A value of unity will be used.

The actual measurements described in the above section are made at baseband by use of a downconverter. The following equation is used to calculate the AM or PM noise generated from

these baseband measurements:

£if) = -S if) = - ^ \J / ^ a \

-J J A J/' X/' V V

(18)

^woMfO«(/) the additive noise down-converted from both the upper and lower (v,j±/)

sidebands to baseband. is the carrier power down-converted via either the upper or lower sideband to a baseband beat of /. Kj^i, Krf, and Kbw are correction factors needed to account for nonlinearity, frequency response, and bandwidth errors in the baseband

measurement. Appendix A shows the equivalence of Eqs. (17) and (18), and Appendix B

describes the techniques to measure these correction factors.

When the bias due to background measurement noise is removed, Eq. (18) can be written as follows:

PSD '^NoiseOn,M (/)J

1-

PSD

PSD

V.NoiseOff,M (/)

V,NoiseOn , M (/)

p fy2 ff) + v2 if\\\\ L_

y Beat-.M \J )^^Beai + .M\J ) SNR

(19)

^NoiseOffMif) SNR are respectively the noise floor of the measurement system for the

additive noise measurement and the signal-to-noise power ratio of the carrier measurements.

13
The same SNR is assumed for both VBeat- and VBeat+ measurements. The logarithmic form of Eq.

(19) is given by:

PSD[vLeojr.Af)S

101og^(/) = 101ogP5D[v^_,,„^(/)] + 101og 1

V dBc/Hz (20)

-101og(vi.,,„^ (/) + V^L.>; (/))-l01og 1

The first term is the measured noise level with noise source ON, the second term is the bias on

the measured noise due to the noise floor (measured with the noise source OFF), the third term is the average of the measured carrier power down-converted via both the upper and lower

sidebands, the fourth term is the bias on the carrier power measurements due to the background

noise, and the last term contains the correction factors.

14
7 Estimation of uncertainty

Normalizing the PSD to a 1 Hz bandwidth and rewriting the measurement Eq. (19) gives

^(/) =

^NoiseOn.M (/) ^NoiseOff.M if)

p iy'- if\ + V'^ {f)\\\ L V

^ Beat-, M \ J 1^ ^ lieat + . M \J ) SNR

(21)

From the Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement

Results [15] [16], the equation for the combined uncorrelated uncertainties (wc) for a measurement result, y, is written as

y — f {x^ , Xj , Xf^f )

a/

ydx^

Sensitivity Coefficients

ir(x,). (22)

In terms of fractional uncertainties Eq. (22) is

Total

Fractional Uncertainty iiUy)

ith Component

,, , Fractional Multiplier Uncertainty

a/

.=1 J

X II' (x)

2 2 y

Multiplier 'th Component

A ^ Fractional Uncertainty

(=1 y

(23)

cr^ is used here to represent the fractional variance. The combined uncertainty for is

therefore

' ay

NoiseOn.M J " ^NoiseOnM ) + ay

3V V NoiseOff J

«'(^^z.) +

" {^NoiseOff ,M )

+

d/

dV

(24)

15
The individual multipliers of (23) are

dV

V,NoiseOn. M 4y,NotseOn. M

iv- \

* Nois. V

\^ ^ NoiseOJf . M J

eOn.M ^ NoiseOff . M

NoiseOJ] .M

NoiseOn , M -V' NoiseOJf , M

KNL KBW

^ Beal-,M

\^ ^ Heal-.M J

4V,Beat-, M

^ Eeai+,M

av

Beal-.M ^ ^ Beui+.M 4V^

\

^ Becil-.M ^ ^ Becil+.M J V SNR- 1 dSNR (SNR-\y

The multipliers are simplified by making the following assumptions:

(25)

(26)

(27)

(28)

(29)

(30)

VNoiseOn. M »V"^-^ * NoiseOff .M V^ Becii+.M -V— * lieai-.M SNR » 1

(31)

The combined fractional uncertainty, (7c, obtained by combining the individual fractional

uncertainties, whether arising from Type A evaluation or Type B evaluation [15], is

A Z I I NoheOn ^Heat- ^Beat + (32)

where riset is the number of repeated measurement sets in a given calibration. (7^ is the

uncertainty characterizing the long-term reproducibility of the PM/AM noise standard between

calibration cycles. This includes tiie combined effect of temperature variations, connector

mismatch, long-term variations of noise or carrier power, effects due to shock during shipping,

and other unknown effects. GNoiseOn and Gseat include uncertainties due to the average of a random process given by ,

16
2 — j-rr^ —

2 _ 2 , 2 ^Bea/ ~ ^It-FFTAve '^iK

(33)

(34)

iVA?o/\se and Nbccv are the number of FFT averages used for the noise and beat measurements

respectively. Gsr is the short-term repeatability of the PM/AM noise standard during a single

calibration. This includes the variation due to temperature fluctuations and variability in the

insertion loss of the internal relays used to enable and disable the carrier and noise source for the

calibration. Appendix C presents a derivation of (32) describing the error of signal power

measurements in the presence of background noise.

The expanded uncertainty (U) is equal to toe, where k is the coverage factor and is chosen to be 2

for a 95.45 % level of confidence [15].

17
8 Uncertainty budget

As stated in the Introduction, the AM and PM noise of the noise standard are usually measured

two times at NIST, once before sending it ("out" measurement) to the customer and a second

time after receiving it back ("in" measurement). The combined uncertainty includes the

contributions of different estimated errors associated with the noise-standard calibration. In

practice, all estimated errors are expressed in the same domain [linear (%) or log (dB)] for the

calculation of combined uncertainty. Typically, the final measurement results for PM and AM

noise are reported in the log domain (dBc/Hz). However, in this calibration, not all errors are available in the same domain. For example, the uncertainty due to a FFT average is statistically

calculated in the linear domain, whereas the uncertainty in the linearity of the FFT analyzer is provided by the manufacturer in dB. Other errors associated with the noise standard and/or

calibration that are experimentally measured can be calculated either in dB or %. We chose to write the measurement and uncertainty equations in the linear domain and convert any errors expressed in dB to the linear domain. When converting dB uncertainties to linear, the upper

and lower confidence range can be unequal for larger en-ors. In this document, we will convert

all the dB errors to their linear values and consider the largest value if they are unequal for the

uncertainty calculation. Certain assumptions concerning distributions in dB cannot always be

properly converted to linear, and vice-versa.

The combined uncertainty is calculated entirely in terms of linear fractional uncertainty and the

final expanded uncertainty (U) result is converted to dB. The uncertainty budget for the

calibration of the PM/AM noise standard is given in Table 1.

Table 1 - Uncertainty budget: PM/AM noise measurement of the noise standard

Sources ofError Estimated

Fractional

Error, %

Effect Type Distribution Divisor Standard

Fractional

Uncertainty

(CT), %

Symbol

Number of FFT averages

for noise measurement

A^A,„„, = 10.000

1.0 Random A Normal 1 1.0 (^N-Ff'TAve

Number of FFT averages

for beat measurement

A^«„„= 100, SNR= 1000

0.0 Random A Normal 1 0.0

Uncertainty in the estimated measurement

bandwidth for the PSD

function. (0.05 dB)

1.2 Systematic B Rectangular V3 0.7

Frequency response of the down convertor (includes

offset signal generator and mixer) at rf

2.3 Systematic B Rectangular V3 1.3

FFT and mixer linearity at baseband4.7 Systematic B Rectangular V3 2.7 Oni.

Small angle modulation

approximation. yS = 0.02

0.0 Systematic B Fixed value 1 0.0 Op

Short term noise standard

repeatability

2.3 Random A Normal 1 2.3 OSR

Long term noise standard

reproducibility

7.2 Systematic B Rectangular V3 4.1 Olr

18
By use of Table 1 and Eq. (32) the expanded fractional uncertainty for values shown in this

example is ± 11 .5 % or ± 0.5 dB for User equal to 6.

It should be noted that this calibration standard creates equal amount of AM and PM noise.

When this type of standard is used to evaluate AM/PM measurement systems, the AM-to-PM or PM-to-AM conversions in the detector cannot be ignored 117]. In a typical PM noise

measurement, AM-to-PM conversion can typically be 15 dB or worse leading to an error of 0.3

% (0.1 dB).

19
9 Validation of the measurement

To further validate the cahbration method, we use two different approaches. In the first approach, the noise of the standard is measured with different PM noise measurement systems

and with different measurement techniques, for example, a direct-digital phase noise

measurement system (DDPNMS) [18], or a photonic delay-line measurement system (PDLMS)

[19]. The agreement between the results of the DDPNMS and/or PDLMS and the calibrated

result validate the calibration method. The second approach is to calibrate a phase noise

measurement system by use of a calibrated noise standard and compare the results with that

obtained by other calibration methods such as a single-sideband modulation, PM/AM

modulation, beat frequency, or static phase shift [7], [20]. All of these methods should give

identical results within the measurement uncertainty.

10 Acknowledgement '

The authors thank Fred Walls for useful discussions and thoughtful comments on this

manuscript, and Tom Parker, Mike Lombardi, David Smith, and Danielle Lirette for their helpful

suggestions in the preparation of this manuscript.

20
Appendix A. Verification of the baseband measurement equation

The phase noise, £{f) and amplitude noise, Sj(f) generated by the PM/AM noise standard is given by

X

1 , , 1 P5D[Noise(v,-/)l +P5D[Noise(F„+/)l

^(/>-5.(/) = — ^ ;

^. p

^ [dBc/Hzorl/Hz] (Al)

2 AKp Carrier Power

The noise represented by Eq. (Al) is not measured directly at rf, but rather indirectly via downconversion to baseband. The following equation, called the "measurement equation," describes

the measurement at baseband:

^NoiseOn if)

1 1 4 ^NL^KF^HW^fi ^UniiAw if)

(A2)

A proof follows that shows that the baseband measurement Eq. (A2) is equivalent to the

definition (Al) when appropriate approximations and correction terms are defined. V^,,,,^^^ (/)

the measured additive noise down-converted from both the upper and lower ( v^, + / ) sidebands

to baseband. Vg"^,,,^,,, (/) is the average of the measured carrier power down-converted via both

the upper and lower sideband to a baseband frequency of /. BWEst is an estimate of the

measurement bandwidth used to calculate the PSD function. Knl, Krf, Kbw and Kfj, to be defined

later, are correction factors to account for nonlinearity, frequency response, bandwidth and small

angle approximation errors in the baseband measurement.

The simplified function of the heterodyne down-converter is described as follows. An offset

signal generator is connected to the LO port of a double-balanced mixer, and the PM/AM noise

standard is connected to the RF port of the mixer via a large attenuator, ensuring linear

conversion from the RF port to baseband. The gain of the down-converter for a given LO

frequency (Vlo) and RF frequency (Vrf) to a baseband IF frequency {f= \Vlo- ^rf\) is

G(y,o ' V- ' le^'^l) = 8VSWH§,F (\^L0 - ^HF \) 8 KF LO ' V )^LVZ. (A3)

where, g's are different gain terms. gyswR represents any mismatch error due to VSWR [21],

gifif) represents the baseband frequency response at IF, 8rf(^lo^^rf'^ represents the rf frequency response of the down-converter at its two operating frequencies, and the 8lvl^^^

represents the response of the down-converter at a specific power, P, at the RF port.

21
When the signals from the offset generator and the noise standard are mixed, two sidebands at ± / are translated to a baseband frequency at / The folded double-sideband downconversion is represented by Eq. (A4) and is shown graphically in Figure 5 [1 1].

^/Lw(/) = G^(v/„,v„ -/,P)V;^,,(v„ -/)-f-G^(v,,Vo + /,P)V4,,(v/o +/), (A4)

where Vpnst is the signal voltage of the PM/AM noise standard at rf.

RF Signal ^ f i, ^ Baseband

V,-f V, V,+f f

Frequency [Hz] Offset Frequency [Hz]

Figure 5. Graphical representation of the baseband calibration measurements. The red and blue traces represent the ojfset generator and the PM/AM noise standard, respectively. The green spectrum is the

down-converted baseband signal. The dark gray trace is the noise floor of the measurement system. The

dotted lines indicate the down-conversion gains, where the light gray dotted line indicates the undesired,

negligible cmd hence ignored, down-converted image.

By use of Eq. (A4) the numerator of Eq. ( A2) can be written as

NoiseOn) (v^ + f). (A5)

VpNST(NoiseOn) reprcscnts the signal voltage of the standard when the additive noise is enabled and

the carrier is off. Pnoise is the power level at the RF port of the mixer during the noise

22
measurement. The upper and lower sideband gains are factored out into a single term and

simplified by a first order Taylor expansion when both sidebands are approximately equal as follows:

c(x+ y) -ax + by ax + by

c =

x + y

a + b

(A6)

c = + O when x ^ y,

where O contains the higher-order terms of the Taylor expansion. Therefore,

'G\v„v,-f, P„,J+G\v,,v, +/, /^_) + 0 V.FNST(Noisenn) '(NiiiscOn) (A7)

Similarly, in the denominator of (A2) can be rewritten, when the contribution from

the unwanted and negligible down-converted image is ignored, as

^Bra/Alt' (/) _

(Vq - /, Vq , P,,.„„ ) + G' {V, + f,v„ P,,.,.,,.

)

FNST(CaiTierOn (A8)

where VpNSTiCamerOn} represents the signal voltage of the standard when the additive noise is off

and the carrier is enabled, and Pcamer represents the power level at the RF port of the mixer

during measurement of carrier power. Substituting the numerator and denominator in Eq. (A2)

with Eq. (A7) and Eq. (A8) gives

^PNST{NoiseOn) /) ^PNST(NoiseOn) /)

1 K

4 ^NL^RF^BW^fi ^PNST[NoisL'On) ^

All common and similar terms are collected in the variable K, given by

(A9)

(AlO)

This clearly shows that the baseband gains as well as VSWR mismatches cancel for the

measurement Eq. (A2).

Finally, the four correction factors K^i, KRf, Kgw and Kp are defined. Knl defines the change in

gain that occurs due to nonlinearity in the down-converter and FFT analyzer due to a difference

in power level between noise and carrier power measurements:

23
(All)

K^r is the ratio of the effective power gain between noise and carrier power measurements.

Ideally, this number should be unity; however, it is affected by the non-flat amplitude response

of the offset generator. It also contains the asymmetrical frequency response of the mixer at its LO and RF ports as well as the higher-order terms of the Taylor expansion of example (A6):

§If (^0 ,Vo-f) + 8i(Vo,Vo + f) + 20

(A12)

Kbw is a correction for an imperfect power spectral density (PSD) function given by

K (A13)

where BWAcmai is the true measurement bandwidth.

Using Eqs. (Al 1), (A12) and (A13) in Eq. (A9), we see that Uiif) at the baseband measurement

equation is equal to the original definition of£{f) at rf (Al) as follows:

1

V,PNST(NoiseOn)^ 0 PNST(NoiseOn

BWAcliiiil 4K

1 PSD PNST{Noi.ieOn)^ 0 4K,

,2PNSTiNoiseOn)''-''(Vo+/) 0

yp.SriCarr.r0.^y^

(A14)

24
Appendix B. Measurement of correction factors, K^l, Km,^ K^w and Kp

(i) Set-up for measuring nonlinearity of the down-converter and the FFT analyzer -

As discussed earlier, K^l is defined as the change in gain that occurs due to nonhnearity in the

down-converter and FFT analyzer due to a difference in power level between noise and carrier

power measurements and given by Eq. (All). The carrier power is measured with additive noise

off, while the noise-power measurements are made with the carrier off.

Noise Standard/

Synthesizer

e

Power

Meter

Offset

Signal

Generator

-33 dB

RF

Double

Balanced

Mixer (g)-&gHLPF

Optional

Amp

LO

Spectrum

Analyzer

-3 dB

Figure 6. Measurement setupfor the estimation ofK^Land Krf.

The measurement system used to measure uncertainty due to the FFT and the mixer nonlinearity

at baseband is shown in Figure 6. The frequency of the offset signal generator is set at Vq + /and

the noise standard at Vq. A portion of the signal from the noise standard is coupled out and

connected to a NIST-calibrated power meter with very low noise floor (-60 dBm). First, the

carrier power (Pcamer) and noise power (Pnoise) of the standard are measured with the power

meter. The noise standard is then replaced by a rf synthesizer at frequency Vq and power equal to

Pearlier- The corrcspondiug down-converted power (Pc-Bear) is measured on the FFT analyzer by

use of a flattop window. Next, the synthesizer power is adjusted to equal the integrated noise

power of the noise standard (P„o,^e), and the down-converted power {PN-Bead is measured on the

FFT analyzer. From these measurements Knl can be calculated as:

^ OLVL\ 2 iPimise P IP J _ ' N-Beal /

-* C-Beal SlVL i^ainier )

(Bl)

25
These measurements are repeated for all the specified offset frequencies ( +/) at each of the three

carrier frequencies. Because the mixer is operating in linear mode, K^l should ideally be equal

to 1. The maximum observed error from unity, t?vL, can be used to construct a rectangular

distribution for Knl- Therefore,

^NL^'^^^='^±(^NL , (B2)

where Gnl is the fractional uncertainty of K^l.

(ii) Set-up for measuring frequency response of the down convertor at rf - Krf

Krf is the ratio of the effective power gain between noise and carrier power measurements and

given by Eq. (A 12). The experimental set-up for determining KRf is the same as shown in Figure

6. In this case, the beat power, Pc-BeatiVLO, ^rf), is measured for four different LO and RF

frequency combinations. For all four measurements, the power of the synthesizer is adjusted so

that its power stays constant at Pcamer- KRfCm then be calculated from

^C-Becil ^C-Beal

^C-Beat (B3)

These measurements are repeated for all the specified offset frequencies (+/ ) at each of the three

carrier frequencies. Krf should ideally be equal to 1 . The maximum observed error from unity,

5rf , can be used to construct a rectangular distribution for Krf. Therefore,

^Rr-^±^-^±(^RF , (B4)

where cTrp is the fractional uncertainty of Krf.

(iii) Measurement of PSD correction factor - Kbw

Kbw as defined in Eq. (A 13) is a correction for an imperfect power spectral density function.

Since the EFT is digitally implemented, the resolution bandwidth of measurement and associated

windows are well defined mathematically. Exact details of the EFT implementation depend on

the manufacturer. The EFT manual should be checked for possible bandwidth uncertainty for a given instrument. Verification of the PSD function can also be implemented by use of a well

characterized filter and a calibrated power meter 114]. In this case, we use Kbw equal to unity

with a fractional uncertainty, (7bw = 0.7 %.

26
(iv) Calculation of small angle modulation correction factor - Kfi

Kp is a correction to the small angle modulation approximation used to calculate J'if ) from a

single sideband power ratio. An effective peak phase modulation P is obtained by integrating the

phase noise and utilized to determine Kji as follows

2js,(/)d/. (B5)

Typically, /u is the half-bandwidth of the band-pass filter in the noise standard.

Kp is chosen to be unity with a fractional uncertainty dp.

fj;(^)/r-{j3) ' K^=i±{£^-i) = i±\ -1 ±(Tr, (B6)

27
Appendix C. Error of signal power measurements in the presence of

background noise

Consider the fast Fourier transform (FFT) of a signal of amplitude A and frequency / , such that

the signal occurs in a single-frequency FFT bin (no leakage to neighboring bins) with white

uncorrelated noise in that bin (and in every bin). Measurements are repeated A'' times and

averaged. Let the noise in the measurement be represented by n. , a Gaussian sequence of

values with zero mean and covariance . Then if the signal amplitude in the frequency bin of

interest is S- , the average of the measurements is

^=^tiS,+^h)- (CI)

We can regard the expectation value of a limited set of measurement as the simple average:

The expected rms error of the measurement due only to the noise is

(C3)

Given the Gaussian uncorrelated property of the noise, we can write

(/2,«.) = C7^4., (C4)

which is zero unless / = j . There are N such terms in the sum in Eq. (C3), so E = —4ng'=-^. (C5)

> Thus the measurement can be reported with a statistical error given by

-TS,±^. , (C6)

Suppose, however, that the FFT is squared and then averaged. We then have for the

measurement

The middle terms drop out, because there is no correlation between the signal and the noise. In

the last sum, the average of the noise is cr' by Eq. (C4). The measurement is then

28
M=-y\s,f+(7\ (C8)

If the noise power is known, it can be subtracted off and the measurement of the average signal

power reported as M-a'= —y\s\\ (C9)

Apart from the propagation of error that occurs in this subtraction, there will be some error associated with the measurement itself. This can be denoted by E, where

=1(m-{m))'

Writing this out,

E' =

(CIO)

(Cll)

There is a rather subtle change in the order in which the operations are performed. If we again assume no correlation between signal and noise, the terms involving the signal in the above

equation all cancel out or vanish. Then

E'=' (C12)

(C13)

Evaluating each of these terms one by one, in the first sum there are N terms with / = j. These

will contribute the amount

J_

There are additional contributions in the first sum with / ^ j, where there are N~ - N = N(N -I) terms, each contributing (o"" ) • The first sum therefore contributes a total of

) Ml M — -w (C14) , A^(A^-1) ^4

H ; <7 .

In the second term of Eq. (C 1 2) , there are N terms each contributing a'^ ^ so the second term

contributes

The last term contributes

N

(C15)

(C16)

Collecting all the terms, the error is given by

1 (T -2a +<7 =-— (7 . N N N

Thus, we have to estimate the fourth moment. In a normalized Gaussian distribution that is a function of x, the probability of getting a value x within the increment dx is

(CI 7)

29
P{x)dx

The fourth moment is

Thus the error is

iTtO

e -'"'dx^Za'

2 3a' la'

N N N

E = ^IjNaThe measurement of signal power can then be reported with an uncertainty as: M -a- ±—i=-.

^|N

(CI 8)

(CI 9)

(C20)

(C21)

Expressing Eq. (C21) in terms of SNR gives

SNR = M

M

SNR

(C22)

30
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Nov-1990.

[21] Hewlett Packard, "Fundamentals of RE and Microwave Power Measurements," Application Note,

no. 64-1, 1978.

31



Technical Publications

Periodical

Journal of Research of the National Institute of Standards and Technology—Reports NIST research and

development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, and information technology. Papers cover a broad range of subjects, with major emphasis on

measurement methodology and the basic technology underlying standardization. Also included from time to time are survey articles on topics closely related to the Institute's technical and scientific programs. Issued six times a year.

Nonperiodicals

Monographs—Major contributions to the technical literature on various subjects related to the Institute's scientific and technical activities. Handbooks—Recommended codes of engineering and industrial practice (including safety codes) devel- oped in cooperation with interested industries, professional organizations, and regulatory bodies. Special Publications—Include proceedings of conferences sponsored by NIST, NIST annual reports, and other

special publications appropriate to this grouping such as wall charts, pocket cards, and bibliographies.

National Standard Reference Data Series—Provides quantitative data on the physical and chemical properties of

materials, compiled from the world's literature and critically evaluated. Developed under a worldwide program

coordinated by NIST under the authority of the National Standard Data Act (Public Law 90-396). NOTE: The

Journal of Physical and Chemical Reference Data (JPCRD) is published bimonthly for NIST by the American

Institute of Physics (AlP). Subscription orders and renewals are available from AIP, P.O. Box 503284, St. Louis,

MO 63150-3284.

Building Science Series—Disseminates technical information developed at the Institute on building materials,

components, systems, and whole structures. The series presents research results, test methods, and perfonnance

criteria related to the structural and environmental functions and the durability and safety characteristics of building

elements and systems.

Technical Notes—Studies or reports which are complete in themselves but restrictive in their treatment of a subject.

Analogous to monographs but not so comprehensive in scope or definitive in treatment of the subject area. Often

serve as a vehicle for final reports of work performed at NIST under the sponsorship of other government agencies.

Voluntary Product Standards—Developed under procedures published by the Department of Commerce in Part 10, Title 15, of the Code of Federal Regulations. The standards establish nationally recognized requirements for products, and provide all concerned interests with a basis for common understanding of

the characteristics of the products. NIST administers this program in support of the efforts of private-sector

standardizing organizations.

Order thefollowing NISTpublications—FIPS and NISTIRs—from the National Technical Information Service,

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Federal Information Processing Standards Publications (FIPS PUB)—Publications in this series collectively

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information in the Federal Government regarding standards issued by NIST pursuant to the Federal Property and

Administrative Services Act of 1949 as amended. Public Law 89-306 (79 Stat. 1 127), and as implemented by

Executive Order 1 1717 (38 FR 12315, dated May 1 1,1973) and Part 6 of Title 15 CFR (Code of Federal

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NIST Interagency or Internal Reports (NISTIR)—The series includes interim or final reports on work performed

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VA 22161, in hard copy, electronic media, or microfiche form. NISTIR's may also report results of NIST projects of

transitory or limited interest, including those that will be published subsequently in more comprehensive form.
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