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NBS

PUBLICATIONS

NBSIR 86-3366

Center for Electronics and

Electrical Engineering

AlllDS MTDDbS

Technical

Publication

Announcements

Covering Center Programs,

July to September 1985 with

1986 CEEE Events Calendar

April 1986

U.S. Department of Commerce

National Bureau of Standards

National Engineering Laboratory

Gaithersburg, Maryland 20899

QC

100

.056

86-3366

1986

EAU J

Q: r?
INTRODUCTION TO THE CEEE TECHNICAL PUBLICATION ANNOUNCEMENTS

This IS the sixth issue of a quarterly publication providing information on the technical work of the National Bureau of Standards Center for Electronics and Electrical

Engineering. Ihis issue of the CEEE Technical Publication Announcements covers the

third quarter of calendar year 1985.

Organization of Bulletin ; This issue contains citations and abstracts for Center

papers published in the quarter. Entries are arranged by technical topic as identified in the table of contents and alphabetically by first author within each topic.

Follcwing each abstract is the telephone number of the individual to contact for more

intormation on the topic; unless otherwise noted, this person is the first author.

This issue also includes a calendar of Center conferences and workshops now planned

tor calendar year 1986, an announcement of recently issued standard reference materials, and a list of sponsors of the work.

Center for Electronics and Electrical Engineering ; Center programs provide national

reference standards, measurement methods, supporting theory and data, and traceability to national standards.

The metrological products of these programs aid economic growth by promoting equity

and etficiency in the marketplace, by removing metrological barriers to improved

productivity and innovation, by increasing U.S. competitiveness in international

markets through facilitation of coitpliance with international agreements, and by

providing technical bases for the development of voluntary standards for domestic and

international trade. These metrological products also aid in the development of

rational regulatory policy and promote efficient functioning of technical programs of

the Government.

The work of the Center is divided into two major programs: the Semiconductor Technology Program, carried out by the Semiconductor Electronics Division (formerly the

Semiconductor toterials and the Processes and Semiconductor Devices and Circuits

Divisions) in Gaithersburg, MD, and the Signals and Systems Metrology Program,

carried out by the Electrosystems Division in Gaithersburg and the Electromagnetic

Fields and Electromagnetic Technology Divisions in Boulder, CO. Key contacts in the

Center are given on the back cover; readers are encouraged to contact any of these

individuals for further information.

Center sponsors: The Center Programs are sponsored by the National Bureau of Standards and a number of other organizations, in both the Federal and private sectors;

these are identified on page 17.

Note on Piiblication Lists ; Guides to earlier as well as recent work are the publication lists covering the work of each division. These lists are revised and reissued

on an approximately annual basis and are available from the originating division.
/< - -j

CEEE Technical Publication Announcements - April 1986

TABLE OF CONTENTS

IJES heseasch information CENTER

Page

o> •

INTRODUCTION inside front cover

SEMICONDUCTOR TECHNOLOGY PROGRAM

Integrated Circuit Test Structures 2 Process and Device Modeling 2 Packaging 2

SIGNALS AND SYSTEMS METROLOGY PROGRAM

FAST SIGNAL ACQUISITION, PROCESSING, & TRANSMISSION 2 Waveform Metrology . 2 Cryoelectronic Metrology 4

Antenna Metrology 5

Noise Metrology 6

Microwave Metrology 7

Optical Fiber Metrology 8

Other Fast Signal Topics 9

ELECTRICAL SYSTEMS 11

Power Systems Metrology 11

Superconductors 12

Magnetic Materials and Measurements 13

ELECTROMAGNETIC INTERFERENCE 13

1986 CEEE CALENDAR 15

RECENTLY ISSUED STANDARD REFERENCE MATERIALS 16

CEEE SPONSOR LIST 17

KEY CONTACTS IN CENTER, CENTER ORGANIZATION back cover
Page 2 CEEE Technical Publication Announcements - April 86

SEMICONDUCTOR TECHNOLOGY PROGRAM

Integrated Circuit Test Structures

Yen, D. , Glendlnning, W. B., and Llnholm, L. W., An Blectrlcal Test

Structure for Proximity Effects Measurement and Correctlcm, J* Electrochem. Soc. , Vol. 132, No. 7, pp. 1726-

1 729 (July 1985).

This paper describes the design of a test structure and electrical test method for estimating the magnitude of proximity effects in electron-beam lithography. The test structure consists of a van der Pauw cross resistor for measuring sheet resistance, a bridge resistor

for measuring electrical linewidth, and

a second bridge resistor simulating a close line-space environment for mea- suring electrical linewidth where proximity ej^osure effects from nearby patterns may be encountered. In this ex- periment, test structures were delineated in aluminum on silicon wafers using

electron-beam ejqjosure and wet chemical

etching. Electrical measurements from

these test structures are compared to

optical measurements to verify the measurement method. In addition, results

from the test structures are used to

estimate the Gaussian parameters for the

Gaussian model commonly used for proximity corrections.

[Contact: Loren W. Linholm (301) 921-

3801]

Process and Device Modeling

Wilson, C.L. , Roitman, P. , and Blue,

J.L., High Accuracy Physical Modeling

of Submicron MOSPETs, IEEE Transactions on Electron Devices, Vol. ED-32,

No. 7, pp. 1246-1258 (July 1985).

Using the data obtained from the mea- surements described in this work, it is

possible to model the drain current for

all of the transistors studied with no adjustable parameters. Transistors with

0.81-ym channel length differ in model

input from those with 8.17-ym channel

length only in the length of the polysilicon gate. Hie accuracy of the simulation is maintained over the subthreahold, triode, and saturation regions and

is comparable for all channel lengths.

[Contact; (301) 921-3621]

Packaging

Oettinger, F.F., Thermal Measurements

of VLSI Packages - A Critical Overview , in book. Abstracts of the

lEEE/NBS VLSI Packaging Workshop,

Gaithersburg, Maryland, September 9-11,

1985, pp. 26-29.

Techniques to thermally characterize

ceramic and plastic VLSI packages are discussed. Computer simulations and

both direct and indirect thermal evaluation techniques are highlighted. Limitations and strengths of the various

techniques are identified.

[Contact: (301) 921-3541]

FAST SIGHAL ACQOISITIOM, PROCESSING,

AND TRANSMISSION

Waveform Metrology

Gans, W.L., Picosecond Pulse Measurements at NBS, Proceedings of the IEEE

Instrumentation and Measurement Technology Conference, 'Kimpa, Florida,

March 20-22, 1985, pp. 142-144.

The primary system used at NBS, Boulder

to measure fast (picosecond to nanosec- ond regime), repetitive, electrical

pulse parameters consists essentially of

a wideband (dc-18 GFfe ) sampling oscilloscope interfaced to a minicomputer.

This paper describes the techniques

employed at NBS to reduce the effects of

two major sources of pulse measurement

error. These two sources are the distortions caused by the sampling head

circuitry and by sample timing jitter.

The techniques employed are based on th»* deconvolution methods of Tikhonov.

[Contact: (303) 497-3538]
CEEE Technical Publication Announcements - April 86 Page 3

Waveform Metrology , cont'd.

Kuffel, J. , Malewski, R., van Heeswijk,

R., and Lawton, R.A., Dynamic Performance of Digital Recorders Used for

Monitoring High Voltage Impulse Tests,

Proceedings of the IEEE Instrumentation

and Measurement Technology Conference,

Tampa, Florida, March 20-22, 1985, pp.

211 - 21

.

Frequency and time domain characteristics of digital transient recorders (in

short, digitizers) are discussed in

order to establish the requirements on digitizers used for high voltage testing, Results of an ejqjerimental study

performed on a 200-MHz, 8-bit digitizer

(Tektronix 761 2D) are presented and

related to the design features of this

instrument. Ihe inherent design characteristics and their influence on the

digitizer dynamic performance are ana- lyzed in view of simulation of the digitizer through a computer model.

[Contact; Robert A. Lawton (3 03) 497-

3339]

Larsen, N.T., Vecchia, D.F., and Sugar,

G . R . , VOR Calibration Services , NBS

Technical Note 1069 (April 1985).

The National Bureau of Standards has

designed, constructed, and evaluated a standard for the support of very-highfrequency omnidirectional range (VOR)

air navigation aids. The standard con- sists of two instruments: (1 ) a digital

waveform signal generator for the com- posite VOR audio waveform, and (2) a standard phasemeter based on time series

analysis of this waveform. Experimental

results, a statistical analysis of them,

and the listings of principal software

are included.

[Contact: (303) 497-371 1]

Lawton, R.A., Pulse Waveform Standards

for Electro-Optics, Picosecond Electronics and Optoelectronics, Proceedings of the Topical Meeting, Lake

Tahoe, Nevada, March 1 3-1 5, 1985, G.A.

Mourou, D.M. Bloom and C.-H. Lee, Eds,,

(Springer-Verlag, Berlin), pp. 205-206.

Ihis paper describes the development of

reference waveform generators for transfer of NBS p\iLse measurement accuracy to

an emerging class of electro-optic sam- plers having picosecond and subpicosecond time-resolution capabilities, A

comb generator appears to be a promising

candidate: it is commercially available

and physically compact, it exhibits good

signal- to-noise ratio, and the waveform

duration covering the most significant

parts of the waveform is commensurate

with one scan of the sampler used.

[Contact; (303) 497-3339]

Lawton, R.A. , Status Report: Transient Waveform Recorder Standard,

Proceedings of the IEEE Instrumentation

and Measurement Technology Conference,

Tampa, Florida, March 20-22, 1985, pp.

154-155.

Ihe origin and activities of the Waveform Measurement and Analysis Technical

Committee of the Instrumentation and

Measurement Society of the IEEE are described. Responding to the recent

availability of several digital waveform

recorders, the committee is developing a performance standard for waveform re- corders. The participants on the com- mittee are identified, and the current

state of development of a draft standard

is given.

[Contact: (303) 497-3339]

Leedy, T.F., and Bell, B.A., Automatic

Test Equipment Calibration/Performance

Verification Evaluation and Research

Program (JLC/DoD Subtask 30702),

NBSIR 84-2978 (December 1984).

This work describes an ejq>erimental

approach to verify the performance of

selected third-generation automatic test

systems. As part of an ongoing project,

this work builds on previous research in

methods to characterize the accuracy of

test systems measuring ac and dc voltages. Ihis report describes the methods

used to characterize an ac voltage
Page 4

! I':,!' S' 1

’

‘

‘ ! CEEE Technical Publication Announcements - April 86

Waveform Metrology , cont'd.

source covering a voltage range of approximately 225 mV to 2.8 V rms over a frequency range of 50 kHz to 10 MHz. In

addition, the characterization of a precision phase angle generator, designed and built at NBS, is described.

Finally, the measurement results obtained with an automatic test system,

using a new software operating system

and the ac, dc, and phase angle transport standards, are discussed in detail.

[Contact; (301) 921-2727]

Cryoelectronic Metrology

Hamilton, C.A., Lloyd, F.L. , and Kautz,

R.L. , Superconducting A/D Converter

Using Latching Comparators, IEEE

Transactions on Magnetics, Vol. MAG-21,

No. 2, pp. 197-199 (March 1985). [Proceedings of plied Superconductivity

Conference, San Diego, California,

September 9-13, 1984]

This paper describes the design and

performance of a six-bit analog- todigital (A/D) converter using fast edge

latching comparators. Simulations predicting conversion times of 100 ps and

1 00-MHz signal bandwidth are verified

ejq^erimentaliy . The addition of a su- perconducting track/hold circuit in

front of the A/D converter is ejqiected

to substantially improve the signal

bandwidth.

[Contact: (303) 497-3740]

Kautz, R.L., Chaos and Thermal Noise

in the RF-Biased Josephson Junction,

J. Applied Physics, Vol. 58, No. 1, pp.

424-440 (1 July 1985).

The effect of thermal noise on chaotic

behavior in the rf -biased Josephson

junction is studied through digital

simulations. In instances for which

chaotic behavior occurs in the noisefree system, it is found that the dynamics of the system are almost unchanged

by the addition of thermal noise unless

the level of thermal noise exceeds that

of the chaotic state. In instances for

which the only stable states of the

noise-free system are periodic solutions, small amounts of thermal noise can induce the junction to hop between

two different dynamical states, producing a low-frequency noise level niich

higher than that of the thermal noise.

Such noise-induced hopping can occur either between two periodic solutions or between a periodic solution and a metastable chaotic solution. When a metastable chaotic state is involved, temperatures somewhat higher than those which

produce hopping can destabilize the

periodic solution to the point where the

system spends virtually all of its time

in the metastable chaotic state, creating noise-induced chaos. The similarities between chaotic behavior at zero

temperature and noise-induced chaos are sufficiently strong that it may be difficult to distinguish the two cases

ejq) e r ime n ta 1 ly

[Contact: (303) 497-3391]

McDonald, D.G. , and Frederick, N.V. , Amplificati<m by a Voltage Locked Array

of Josephson Junctions, Applied Physics Letters, Vol. 47, No. 5, pp. 530-

532 (1 Septanber 1985).

We have studied a new type of Josephson

junction amplifier which is based on a two-junction array; the junctions are mutually phase locked at the Josephson

self -oscillation frequency. With this

frequency at 82 GHz, the voltages of the

junctions remain equal (locked) for a bias current range as large as 60% of

the critical current. Over a much

smaller bias range, with an applied

signal frequency of 1 kHz, a smallsignal power gain of 19 dB was measured,

accompanied by a negative resistance

input impedance. This performance is

consistent with a quasi-static theory of

the amplifier.

[Contact: (303) 497-51 1 3]

McGrath, W.R., Raisanen, A.V., Richards,

P.L., Harris, R.E., and Lloyd, F.L. ,
CEEE Technical Publication Announcements - April 86 Page 5

Cryoelectronic Metrology ^ cont'd.

Accurate Noise Meeisurements of Superconducting Quasiparticle Array Mixers,

IEEE Transactions on Magnetics, Vol.

MAG-21, No. 2, pp. 212-215 (March

1 985) . [Proceedings of Applied Superconductivity Conference, San Diego,

California, September 9-13, 1984]

We have constructed a 30- to 40-GHz test

apparatus which allows us to measure the

noise temperatures of superconductorinsulator-superconductor (SIS) mixers

with an accuracy of better than ±1 K.

This is a factor of six improvement over

earlier measurements. The most accurate

measurement made thus far of a mixer

which uses a single Pb-alloy junction

yielded Tj^j = 9.2 ± 0.9 K; and mixer

gain: C^^ = 0.240 ± 0.005. In addition, SIS mixers employing arrays of N =

1, 5, 10, 25, and 50 tunnel junctions in

series have been tested. Ihe input

power required to saturate the array

mixers was found to increase as and

the gain and noise temperatures of the

array mixers were independent of N.

[Contact: Richard E. Harris (303) 497-

3776]

Muhlf elder, B., Beall, J. A., Cromar,

M.W., Ono, R.H. , and Johnson, W.W.,

Well Coupled, Low Noise, dc SQDIDS,

IEEE Transactions on Magnetics, Vol.

MAG-21, No. 2, pp. 427-429 (March

1985). [Proceedings of Applied Superconductivity Conference, San Diego,

California, September 9-13, 1984]

We have designed, fabricated, and tested

a Double Transformer (DT) coupled dc

SQUID (Superconducting Quantum Interference Device) with low noise, an input

inductance of 1 pH, and a smooth inputoutput characteristic. A transmission

line model is presented to ejqjlain a resonance in the input-output characteristic of early versions of this device.

Guided by the results of numerical simulations, a new version of this device

results are presented that show that the

resonance can be moved to a higher voltage by reducing the area of the SQUID

loop. The voltage-external flux characteristic of some of these new devices

agrees to within 10% with computer simulations. The minimum detectable energy

per unit bandwidth (MDE) referred to the

SQUID loop is 10 h, where h is Planck's

constant. Ocmputer simulations indicate

an MDE of 6 h.

[Contact: (303) 497-3597]

Ono, R.H., Beall, J. A., and Harris,

R.E. , Fabrication of a Miniaturized

DCL OR Gate, IEEE Transactions on Magnetics, Vol. MAG-21, No. 2, pp. 846-

849 (March 1985). [Proceedings of

Applied Superconductivity Conference,

San Diego, California, September 9-13,

1984]

Using niobium edge junctions and

electron-beam lithography (EBL), we have

made direct-coupled-logic (DCL) OR gates

with 1-pm minimum linewidths. The gate

cell, containing an isolator and a buffer section, fits into an area of approximately 25 by 30 pm^.

Our computer simulations show that these

gates can have switching times of less

than 10 ps. We have simulated the DCL

circuit with several values of the most

space-consuming element, an inductor.

This paper describes the results of

these simulations and presents a detailed description of the 7-level fabrication process. The mix of optical and

electron-beam lithography used relies

heavily on an inejqpensive, yet powerful,

circuit layout program.

[Contact: (303) 497-3762]

Antenna Metrology

Hill, D.A., Out-o£-Band Response of

Reflector Antennas, NBSIR 85-3021

(April 1 985) .

The response of reflector antennas to

out-of-band frequencies has been ana- lyzed using physical optics. A simple

approximate expression has been obtained

for the effective aperture, and this
Page 6 CEEE Technical Publication Announcements - April 86

Antenna Metrology ^ cont'd.

ej^ression yields both the receiving

pattern and the trequency dependence on the on-axis gain. Ihe theory has been

compared with published out-of-band

measurements, and the pattern agreement

is good, but the measured gain falls

below the theory. This discrepancy is

caused by mismatch loss in the coax-towaveguide adapter.

[Contact; (303) 497-3472]

Hill, D.A., and Koepke, G.H., A NesurField Array of Yagi-Uda Antennas for

Electromagnetic Susceptibility Testing, NBS Technical Note 1082 (July

1 985) .

In electromagnetic susceptibility testing of electronic equipment, the ideal

incident field is a plane wave. To

approximate this condition, a seven- element array of Yagi-Uda antennas has

been constructed and tested at a frequency of 500 MHz. The element weightings are determined by a near-field

synthesis technique which optimizes the

uniformity of the field throughout a rectangular test volume in the near field of the array. The amplitude and

phase of tne electric field have been

measured throughout the test volume with

a short dipole probe, and the agreement

with the theory is excellent.

[Contact: (303) 497-3472]

Muth, L.A., A Theory of Mutual Impedances and Multiple Reflections In an

N-Element Array Environment, NBS

Technical Note 1078 (February 1985).

A general theoretical approach is formulated to describe the complex electromagnetic environment of an N-element

array. The theory reveals the elementto-element interactions and multiple

reflections within the array. From the

formulation, it is found that the interaction between an excited element and an open-circuited element can be viewed as the sum of terms describing all possible

signal paths within the array environment which start from the radiating

element and terminate on the element

under observation. Within all paths

except the most direct one, multiple

reflections between subgroups of elements take place. The resulting solution is highly structured and recursive

and is discussed in detail in the text.

Illustrative examples are provided to

facilitate understanding of these

ideas.

[Contact: (303) 497-3603]

Wyss, J.C., and Sheeran, S.T., A Practical Optical Modulator and Link for

Antennas, J. Lightwave Technology,

Vol. LT-3, No. 2, pp. 316-321 (April

1985) .

This paper describes a practical application of a technique for coupling an antenna to a receiver using a passive

fiber-optic link. This technique should

avoid pickup and electromagnetic perturbations normally associated with the use

of electrically conductive cables.

Laser light (632.8 nm) is modulated at

the antenna by an electrooptic lithiumtantalate crystal and is then transmitted with a fiber-optic cable to the

receiver electronics. Using an ava- lanche photodiode, the amplitudemodulated optical signal is converted to an electrical signal. The crystal is

mounted directly on an antenna without

amplifiers or other electrically powered

components. Using a broad-band antenna

with fields generated in an anechoic

chamber and a standard TEIM cell, the

frequency response as measured dropped 3 dB per 1.0 GHz from 100 MHz to at least

2.0 GHz, with a s ignal-to-noise ratio of

5 dB with a 1.0-V/m field and a 1.0-kHz

bandwidth. A dynamic range of at least

60 dB is shown.

[Contact: Charles K. S. Miller (303)

497-31 31]

Noise Metrology

Daywitt, W.C., A Derivation for the

Noise Temperature of a Hom-Type Noise

Standard, Metrologia, Vol. 21, pp.
CEEE Technical Publication Announcements - April 86 Page 7

Noise Metrology ^ cont'd.

1 27-1 33 (1985) [previously published

as Appendix A, NBS Technical Note 1071,

December 1983].

Noise sources consisting of an electromagnetic horn aimed at an absorbing

material have been in use for many

years. A satisfactory derivation of the

noise temperature for such a configuration has been missing, however, preventing the use of this horn-type noise

source as a primary reference standard.

The derivation described in this paper

models the various noise emitters within

the source well enough to provide an accurate estimate of the noise temperature and a conplete error analysis.

[Contact: (303) 497-3720]

Daywitt, W.C., Broadband Noise Source

Applications^ Proceedings of the IEEE

Instrumentation and Measurement Technology Conference, Tampa, Florida,

March 20-22, 1985, pp. 165-166.

Accurate noise characterization of am- plifiers and communication systems re- quires the use of thermal noise standards. This note is a brief review of

the use of such standards as a basis for

the measurement of effective input noise

temperature and the G/T of a satellite

earth terminal receiving system.

[Contact: (303) 497-3720]

Perera, S., Noise Temperature Measurements at the National Bureau of Standards, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Tampa, Florida, March

20-22, 1985, pp. 159-160.

Thermal noise presents the ultimate

limitation in the reception and detection of Icw-level electromagnetic signals. This paper briefly reviews the

physics of thermal noise, devices that

generate noise, and measurement methods

to characterize noise sources.

[Contact: (303) 497-3546]

Reeve, G. R., and Miller, C.K.S., Current: NBS Metirology Capabilities and

Limitations at Millimeter Wave Frequencies, Proceedings of the 1985 Measurement Science Conference, Santa

Clara, California, January 1 7-18, 1985,

pp. 296-314.

The National Bureau of Standards (NBS)

establishes national artifact standards

and provides a metrology base for U.S.

industry and technology. In the millimeter wave frequency spectrum, NBS has

not established all of the required

metrology to meet the needs of industry

or government for this technology. It

is the intent of this paper to describe

the technical demands of responding to

the challenges of millimeter-wave technology. A description of the current

capabilities that exist at NBS is given

for those parameters and frequencies

where measurement services exist. Where

novel standards have been developed,

such as the 94-GHz thermal noise standard, the physical basis for the standard is described to indicate the

changes from lower frequency designs and

the challenges that had to be overcome. Limitations in services and in concepts

of standards for providing those ser- vices are described to indicate the

degree of research that must be undertaken to satisfy future industrial needs

in this evolving technology.

[Contact: (303) 497-3557]

Microwave Metrology

Holt, D.R., and Hoer, C.A., Estimation

of True Power Ratios in Six-Port Network Analyzers Using Diode Detectors,

Proceedings of the IEEE Instrumentation

and Measurement Technology Conference,

Tampa, Florida, March 20-22, 1985, pp.

140-141.

A model for detector nonlinearity is

included in the determination of sixport parameters without using additional

standards. A computer simulation was performed assuming that the true power
Page 8 CEEE Technical Publication Announcements - April 86

Microwave Metrology ^ cont'd.

into each six-port detector is related

to the power observed by the detector.

Simultaneous estimation of the six-port

and detector parameters is acconplished

through a nonlinear least-squares algorithm. Results of the simulation com- pare the reflection coefficient r com- puted from corrected power readings and

r calculated from observed power readings . [Contact: (303) 497-3574]

Juroshek, J.R., and Hoer, C.A., A

Technique for Extending the Dynamic

Range of the Dual Six-Port Network

Analyzer, IEEE Transactions on Microwave Theory and Techniques, Vol.

MTT-33, No. 6, pp. 453-459 (June

1 985) .

The dynamic range of the six-port type

of automatic network analyzer is typically limited to measuring two-port

devices with a transmission coefficient

the range of 0 to -60 dB. Ihis

paper describes a subcarrier approach

for extending the dynamic range of the

dual six-port network analyzer. The

subcarrier is generated by inserting a

1 0-kHz , biphase modulator ahead of one of the six ports. With the subcarrier

approach, measurements of S

^2 the

range of -60 to -100 dB can be made.

Test results are presented shewing mea- surements of S ^2 = with a precision of ±0.05 dB or better, and an accuracy of ±0.16 dB or better at 3 GHz.

Measurement results are also presented

showing the dynamic range achievable

with thermistor and barretter detectors.

[Contact: (303) 497-5362]

Kanda, M. , and Orr, R.D. , A RadioFrequency Power Delivery System: Procedures for Error Analysis and SelfCalibration, NBS Technical Note

1 083 (August 1985).

An expression is developed for net power

delivered to a load in terms of the

indicated forward and reflected power

and the system S-parameters and reflection coefficients. The directional

coupler is treated as nonideal with

power reflections assuned between all

ports. The system itself is used to

evaluate the major S-parameter terms in

net power computation, and uncertainty

in the computer power is derived from

origins in the power meter readings and

incompletely known S-parameters.

[Contact: (303) 497-5320]

Reeve, G.R., and Miller, C.K.S., Current NBS Metrology Capabilities eund

Limitations at Millimeter Wave Frequencies, Proceedings of the 1985 Measurement Science Conference, Santa

Clara, California, January 1 7-18, 1985,

pp. 296-314.

The National Bureau of Standards (NBS)

establishes national artifact standards

and provides a metrology base for U.S.

industry and technology. In the millimeter wave frequency spectrum, NBS has

not established all of the required

metrology to meet the needs of industry

or government for this technology. It

is the intent of this paper to describe

the technical demands of responding to

the challenges of mi 1 lime ter-wave technology. A description of the current

capabilities that exist at NBS is given

for those parameters and frequencies

where measurement services exist. Where

novel standards have been developed,

such as the 94-GHz thermal noise standard, the physical basis for the standard is described to indicate the

changes from lower frequency designs and

the challenges that had to be overcome. Limitations in services and in concepts

of standards for providing those ser- vices are described to indicate the

degree of research that must be undertaken to satisfy future industrial needs

in this evolving technology.

[Contact: (303) 497-3557]

Optical Fiber Metrology

Rodhe, P.M., Intramodal Part of the

Transfer Function for an Optical Fiber,
CEEE Technical Publication Announcements - April 86 Page 9

Optical Fiber Metrology ^ cont'd.

J. Lightwave Technology, Vol. LT-1 3,

No. 1, pp. 1 54-1 58 (February 1985).

Intramodal contributions in measurements

of optical fiber bandwidth are investigated theoretically and experimentally

in the quasimonochroma tic case. A relation is established between the intramodal transfer function and a possibly

non-Gaussian source spectrum, which may

also vary with modulation frequency. By

considering the latter variation in

particular, we are able to predict the

intramodal length dependence and show

how it may deviate from that of a con- ventional approach.

[Contact: Aaron A. Sanders (303)

497-5341]

Other Fast Signal Topics

Katzir, Y. , Young, M. , and Glaser, I.,

Pattern Recognition Using Incoherent

OTF Synthesis and Edge Enhancement,

Applied Optics, Vol. 24, No. 6, pp.

863-867 (1 5 March 1985).

This paper describes a system for pattern recognition using an incoherentoptical correlator. The system uses optical transfer function synthesis to

perform correlations with an edgeenhanced image of the object or pattern

being sought. The resulting correlations are free of bias and show good

discrimination between objects. In

addition, the difficult or timeconsuming computations are performed

before the operation of the system; this

reduces the amount of postprocessing by

computer and should allow real-time

operation at video rates.

[Contact: Matt Young (303) 497-3223]

Kline, K.E., and DeWeese, M.E., Metrology for Elect:romagnet±c Technology:

A Bibliography of NBS Publications,

NBSIR 85-3029 (July 1985).

This bibliography lists the publications

of the personnel of the Electromagnetic

Technology Division of NBS in the period

from January 1970 through December 1984.

A few earlier references that are directly related to the present work of

the Division are included.

[Contact: (303) 497-3678]

Major, J.R., Livingston, E.M., and

Adair, R.T., Automatic Frequency

Response of Frequency-Modulated Generators Using the Bessel Null Method,

24th ARFTG Conference Digest, F^ll

1984, Columbia, MD, December 5-6, 1984,

pp. 131-153 (1985). [An identical

invited paper will be published in the

Proceedings of the Test and Measurement

World Expo, San Jose, California, May

1 3-15, 1985.]

This paper describes a Bessel null technique to measure the frequency response

of a frequency-modulated rf carrier and

a program to automate frequency response

measurements of signal generators with

output frequencies from 0.450 to 2000

MHz . The measurements obtained using

this technique are more accurate than

those obtained by a highly trained technician using a manual system.

Automated measurement of this process is

desirable since the manual method is

subject to the following problems: (1)

excessive time, (2) error in finding the

null, and (3) lack of assurance that the

null is the first Bessel null. Automated measurements can be performed

using a system controller, a spectrum

analyzer, a function generator, and a voltmeter (all of which are compatible

and controllable remotely).

Ihe nonlinear relationship between modulating signal amplitude and the center

frequency amplitude of the carrier is a major obstacle to automated measurement.

This problem was solved by obtaining an approximate formula for this nonlinear

curve.

Assurance that the null found is the
Page 1

CEEE Technical Publication Announcements - April 86

Qtner Fast Signal Topics ^ cont'd.

first Bessel null is provided by the

analysis of the frequency response of

the signal generator under test as displayed on the spectrum analyzer.

[Contact; (303) 497-3149]

Reeve, G.R., and Miller, C.K.S., Current NBS Metrology Capabilities and

Limitations at Millimeter Wave Frequencies, Proceedings of the 1985 Measurement Science Conference, Santa

Clara, California, January 17-18, 1985,

pp. 296-314.

The National Bureau of Standards (NBS)

establishes national artifact standards

and provides a metrology base for U.S.

industry and technology. In the millimeter wave frequency spectrum, NBS has

not established all of the required

metrology to meet the needs of industry

or government for this technology. It

is the intent of this paper to describe

the technical demands of responding to

the challenges of millimeter-wave technology. A description of the current

capabilities that exist at NBS is given

for those parameters and frequencies

where measurement services exist. Where

novel standards have been developed,

such as the 94-GHz thermal noise standard, the physical basis for the standard is described to indicate the

changes from lower frequency designs and

the challenges that had to be overcome. Limitations in services and in concepts

of standards for providing those ser- vices are described to indicate the

degree of research that must be undertaken to satisfy future industrial needs

in this evolving technology.

[Contact: (303) 497-3557]

Young, M., and Johnson, E.G. , Jr., Redefining the Scratch Standards, NBS

Technical Note 1080 (February 1985).

[Some of this material was presented in

a paper. Tunable Scratch Standards,

given at the conference of the International Society for Optical Engineering,

Measurement and Effects of Surface

Defects and Quality of Polish, Los

Angeles, CA, January 21-22, 1985, and

published in Proc. SPIE, Vol. 525, pp.

70-77, SPIE, P.O. Box 20, Bellingham,

WA 98227 (1985) .]

The scratch standard ( MIL-0-1 3830A ) is a cosmetic standard that is effected by a visual conparison with a set of submasters that are in turn evaluated by com- parison with a set of master standards.

Both manufacture and certification of

the submasters are somewhat unreliable.

In this paper, we show that the submasters can be classified according to the

relative power scattered at a relatively

small angle. We have designed etched

gratings with which to replace the submasters; these gratings have the appear- ance of scratches but diffract light

into a broad peak between 5 and 10 degrees off the axis of the incident beam.

We have classified some prototypes both

by comparison with the master standards

and by a photoelectric measurement;

agreement between the two methods is

good. We suggest that such gratings be

used as the submasters and possibly that

they be classified by a photoelectric,

rather than visual, measurement.

[Contact; (303) 497-3223]

Young, M., Scratch Standards Should

Not Be Used to Predict Damage Threshold in Laser Induced Damage in Optical Materials; 1982, Proceedings of a Symposium, H.E. Bennett, A.H. Guenther,

D. Milam, and B.E. Newman, Eds., NBS

Special Publication 669 (January

1984) .

The scratch and dig standards are the

most widely used surface quality standards in the industry. In the Proceedings of the 1980 Symposium, H. Bennett

showed theoretically that damage ought

to be initiated near a defect and re- lated dcunage threshold to defect size.

Evidently, because of one or both of

these considerations, some purchaser*

may use the scratch standards to specify

the surface quality of components Intended for high power laser systems.
CEEE Technical Publication Announcements - April 86 Page 1

Other Fast Signal Topics ^ cont'd.

Although damage is often associated with

the presence of a defect, this is an

inappropriate use of these purely cos- metic standards; the classification of a particular scratch correlates only very

loosely with its width or depth. Even

if a component is made of glass, little

or nothing pertinent to damage threshold

may be determined by classifying a scratch according to the cosmetic standard.

[Contact: (303) 497-3223]

Young, M. , The Scratch Standard Is

Not a Performance Standard, Proceedings of the Optical Fabrication and

Testing Workshop, Cherry Hill, New

Jersey, June 1 2-13, 1985, pp. ThAA4-1

and 2.

A history and description of the scratch

standard is presented, shewing that the

scratch number should never be related

to its width and that the standard is

cosmetic only.

[Contact; (303) 497-3223]

ELECTRICAL SYSTEMS

Power Systems Metrology

Misakian, M., High Voltage Divider and

Resistor Calibrations, NBS Technical

Note 1215 (July 1985).

An NBS calibration service for determining the ratio of high voltage dc dividers and the resistance of high voltage

resistors is described. Calibrations

are performed with a Wheatstone bridge

apparatus with a simple guard system.

Sources of systematic error are identified and methods for characterizing the

NBS standard high voltage resistors are

discussed. Ratio and resistance values

can be detemined between the voltages

of 1 0 kV and 150 kV with an uncertainty

of less than ±0.01%.

[Contact: (301) 921-3121]

Petersons, O. , and Mehta, S.P. , Calibration of Test Systems for Measuring

Power Losses of Transformers, NBS

Technical Note 1204 (August 1985).

A calibration system for accuracy verification and alignment of test systems

for measuring transformer losses is

described. Methodologies are presented

for assessing measurement uncertainties

and for evaluating overall accuracy of

test systems. Procedures are suggested

for continuing maintenance and calibration of standard instruments and test

systems to ensure traceable measurements.

[Contact; (301) 921-2328]

Ramboz , J.D., and Petersons, 0. , Bnerging New Requirements for Electric

Power and Energy Measurements, Proceedings of the 1985 Workshop and Symposium of the National Conference of

Standards Laboratories, Boulder, Colorado, July 15-18, 1985, pp. 3-12.

Advances in electronic instrumentation

technology have brought greater stability and precision to transducers that

are utilized for measuring electric

power and energy. An advantage of instruments based on electronic transducers is that they can be readily

adapted to the measurement of other

quantities such as current, voltage,

reactive and apparent power, power factor, demand, time-of-day readings, etc.

The increases in the cost of energy

during the past decade have stimulated

the acceptance of new instrument technology by the users associated with the

electric power industry. 'Ihe electronic

instruments have especially found acceptance in metering installations for

large loads and at interchange points

between utilities. Modern instruments,

because of their accuracy capabilities,

are also advantageous in those applications where the efficiency of large

equipment such as generators and transformers has to be measured. A large

number of instruments used as physical

standards by the industry and submitted

recently to the National Bureau of Stan-
Page 1

CEEE Technical Publication Announcements - April 86

Power Systems Metrology , cont'd.

dards (NBS) for calibration have been of

the electronic type. Ihe calibration

accuracies requested from NBS for power

and energy measurements have increased

at least fivefold (uncertainty reduction

from ±0.05% to ±0.01%) within the past

several years. Calibrations for different quantities and values are being

requested. These changing calibration

requirements and the response of NBS to

meet the requests of its calibration

clientele are discussed.

[Contact: (301) 921-3121]

Schwitz, W., Kampfer, R., Braun, A.,

Souders, T.M., Moore, W.J.M., Cassidy,

B.R., and Deacon, T.A., International

Comparison of Current Transformer Calibrations, IEEE Transactions on Instrumentation and Measurement, Vol.

IM-34, No. 2, pp. 234-238 (June 1985).

An international comparison of current

transformer calibrations among five

metrology laboratories has been con- ducted. The measurements were made at

current ratios ranging from 1 A:1 A to

200 A:1 A at 10, 100, and 200 percent of

rated current and from 5 A;5 A to

200 A:5 A at 1, 10, 100, and 200 percent

of rated current, at a frequency of 50

Hz . Several ratios have also been

compared at 60 Hz.

[Contact; T. Michael Souders (301)

921-2727]

Siddagangappa, M.C., and Van Brunt,

R.J., Decomposition Products from

Corona in SFg/N2 and SFg/02 Mixtores,

Proceedings of the Eighth International

Conference on Gas Discharges and Their

Applications, Oxford, England, September 16-20, 1985, pp. 247-250.

AOsolute concentrations of SOF^, S0F2»

SO

2 F

2

, SO

2

/ NO, N

2 O, and H

2 O produced

from continuous, dc, point-plane negative corona at a current of 40 A were measured in SFg/N

2 and SFg /02 mixtures

containing trace amounts of H

2 O and 1 to

95% N

2 or 1 to 10% O

2 for a total gas

pressure of 200 kPa (~2 atm). The absolute and SFg-normalized charge rates-ofproduction for these by-products have

been determined as a function of N

2 or O

2 content. The results are interpreted

in terms of a model for electricdischarge-induced decomposition of SFg

discussed previously by Van Brunt. The

presence of N

2 accelerates the rate of

SFg decomposition by inhibiting the

recombination of SFg dissociation products. At levels up to 10%, ©2 actually

lowers the rates of oxyfluoride and SO 2 production due to its effect in reducing

the mean energy of electrons in the

discharge and thus the dissociation rate

of SFg.

[Contact: Richard J. Van Brunt (301)

921-31 21]

Superconductors

Ekin, J.W., Yamashita, T. , and Hamasaki,

K. , Effect of Onlulal Strain on the

Critical Current and Critical Field of

Chevrel Phase PbMOgSg Superconductors,

IEEE Transactions on Magnetics, Vol.

MAG-21, No. 2, pp. 474-477 (March

1985). [Proceedings of Applied Superconductivity Conference, San Diego,

California, September 9-1 3, 1984]

The first measurements of the effect of

uniaxial strain on the critical current

of a Chevrel-phase superconductor,

PbMOgSg, have been obtained at 4.2 K in

magnetic fields from 2 T to 24 T. The

data show there is a very significant

reversible effect of elastic strain on

the critical current of PbMOgSg, comparable in magnitude to that observed in

NbgSn. This is because both the peak

pinning force and upper critical field are very sensitive to elastic strain. A

correlation is noted between the elastic

strain effect, radiation sensitivity,

and crystal phase.

[Contact; (303) 497-5448]

Hong, M., Maher, D.M., Ellington, M.B.,

Heilman, F. , Geballe, T.H. , Ekin, J.w.

and Holthuis, J.T. , Further Inveetigationfl of the Solid-Liquid Reaction
CEEE Technical Publication Announcements - April 86 Page 1

Superconductors , cont'd.

and High-Field Critical Current Density

in Liquid-Infiltrated Nb-Sn Superconductors, IEEE Transactions on Magnetics, Vol. MAG-21, No. 2, pp. 771-774

(March 1985). [Proceedings of Applied

Superconductivity Conference, San

Diego, California, September 9-13,

1 984]

Superior superconducting properties,

such as high critical current density

(j(,) and transition temperature

(Tj,), have been obtained from reacted

liquid-infiltrated Nb-Sn composite

wires. These excellent properties are attributed to the chemistry and

structure of the material which is

prepared by a unique solid (Nb) -liquid

(Sn) reaction. From heat capacity

measurements, sharp bulk superconducting

transitions of the A1 5 phase occur at

17.2-18 K and the weight fraction of A1 5 xn the conposite wire is ~23%. Analytical electron microscopy techniques

have shown that: the microstructure of

these conductors consists of alternating

large- grain and small-grain filaments;

these two types of filaments correspond

to BCC Nb(Sn) and cubic A1 5 ^ 7 5 ± ^ 2 5 + X phases, respectively; the A1 5 filaments (<0.5 ym) are

chemically homogeneous in terms of measured x-ray intensity ratios to within

±7% which implies that x ~ 1.5; and the

A1 5 grains are essentially free of ex- tended lattice disorder do\vn to a reso- lution of ~0.34 nm.

Recent work in which Nb is alloyed with

Ta has shown that these superconducting

properties can be improved upon; e.g.,

high overall J^'s of ~1.8 x 10^ A/cm^

at 20 T and 4.2 K have been measured.

Also, the liquid-infiltrated Nb(Ta)-Sn

composites have a damage strain tolerance nearly double that of commercial

bronze-processed Nb-Sn conductors.

[Contact: John W. Ekin (303) 497-5448]

Magnetic Materials and Measurements

Cromar, M.W., Clark, A.F., and Fickett,

F . R . , The NBS Magnetic Nonopole Detector, IEEE Transactions on Magnetics, Vol. MAG-21, No. 2, pp. 418-420

(March 1985). [Proceedings of Applied

Superconductivity Conference, San

Diego, California, September 9-13,

1984]

We have built and operated several inductive type monopole detectors, the

present one having three concentric,

orthogonal loops operated in coincidence. The area of each loop is 200

cm2, and the cross-sectional area of the

superconducting shield is 700 cm^. The

detector loops are in a trapped magnetic

field of approximately 3 milligauss.

The system is mechanically stable and is

relatively insensitive to external disturbances, both mechanical and electromagnetic. The detector is quiet, having

a signal- to-noise ratio for monopole

detection of approximately 20. We have

also investigated several sources of

noise and spurious signals which might

mimic a monopole event.

[Contact: (303) 497-5375]

ELECTROMAGNETIC INTERFERENCE

Bensema, W.D., Reeve, G. , and Koepke,

G. F., A Multisensor Automated EM

Field Measurement System, Proceedings

of the IEEE Instrumentation and Measurement Technology Conference, Tampa,

Florida, March 20-22, 1985, pp. 200-

202.

A system is being developed to monitor

and collect electromagnetic (EM) field

strength at multiple locations simultaneously. The system has two modes of

operation: (1 ) for sampling EM fields

that are stationary for times of the

order of 200 ms, and (2) for sampling

changing EM fields with a system resolution of 10 ys. Sensing elements for

Mode 1 consist of three electrically

short orthogonal dipoles mounted together, single dipole elements, or small

loop antennas. Each element feeds a separate data input channel for a maximum of 30 channels. Rf energy is con- verted to dc by a small diode detector
Page 1

CEEE Technical Publication Announcements - April 86

Electromagnetic Interference » cont'd.

at each dipole. Several sets of 30

sensing elements each are planned to

cover specific measurement regions of

amplitude (1 V/m or greater) and frequency (100 MHz -18 Gife). Mode 2 sensors

are diode detectors driven by broadband

antennas. System computer data processing proceeds in real time and includes

calculation of field strength based on probe calibrations and processing of

resultant data to satisfy measurement

goals.

[Contact: (303) 497-3465]

Cruz, J.E., and Larsen, E.B., Screenroom Measurements of Antenna Factors

Proceedings of the IEEE Instrumentation

and Measurement Technology Conference,

Tampa, Florida, March 20-22, 1985, p.

208.

The measurement of electromagnetic

fields in a shielded enclosure (screenroom) has serious problems because of

uncertain antenna factors and multipath

reflections from conductive surfaces.

Most electromagnetic interference antennas at NBS are calibrated in a known

field at an open-field site using the

standard antenna method. Because these

antenna factors are not necessarily

applicable for making measurements in a screenroom, the measurement errors are difficult to determine. This paper

presents the results for antenna factors

determined in a screenroom using the

two-antenna method. These antenna factors are compared with antenna factors

determined at an open-field site and in

an anechoic chamber. Experiment data

are presented to show the variability of

antenna factor as a function of frequency and location in the screenroom,

thereby providing an indication of error

bounds

[Contact: (303) 497-3763]

Hill, D.A., and Koepke, G.H. , A NearField Array of Yagl-Uda Antennas for

Electromagnetic Susceptibility Testing, NBS Technical Note 1082 (July

1985) .

In electromagnetic susceptibility testing of electronic equipment, the ideal

incident field is a plane wave. To

approximate this condition, a seven- element array of Yagi-Uda antennas has

been constructed and tested at a frequency of 500 MHz. The elanent weightings are determined by a near-field

synthesis technique which optimizes the

uniformity of the field throughout a rectangular test volume in the near field of the array. The amplitude and

phase of the electric field has been

measured throughout the test volume with

a short dipole probe, and the agreement

with the theory is excellent.

[Contact: (303) 497-3472]

Kanda, M., and Nahman, N.S., Standards

for Measurement of Blectromagnetic

Fields, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Tampa, Florida, March

20-22, 1985, pp. 20-23.

The standards developed at NBS for mea- surements of electromagnetic fields are reviewed along with the industrial

applications that engendered their development. Some attention is given to

future measurement requirements and the

NBS programs to meet them.

[Contact: (303) 497-5320]

Kanda, M., Randa, J. , and Nahman, N.S.,

Possible Estimation Methodologies for

Electromagnetic Field Distributions in

Complex Environments, NBS Technical

Note 1081 (March 1985).

The problem of measuring and characterizing complicated multiple-source,

multiple-frequency electromagnetic environments is becoming more important and more difficult as electrical devices

proliferate. This paper outlines three

general approaches to the problem which are currently under investigation at the

National Bureau of Standards. The three

approaches are: (1 ) a statistical

treatment of the spatial distribution of
CEEE Technical Publication Announcements - April 86 Page 1

Electromagnetic Interference ^ cont'd.

electromagnetic field intensities, (2) a numerical confutation using a finitedifference (or lattice) form of the

electromagnetic action functional, and

(3) use of a directional probe to scan a volume. All three methods are still in

the developonent stage, but each appears

promising,

[Contact: (303) 497-5320]

Larsen, E.B., and Cruz, J.E., E cmd H

Fields in Transmission Lines and Coils

for Susceptibility Testing, Pr<d>e Calibration, and RF E3cposure Chambers,

Proceedings of the IEEE Instrumentation

and Measurement Technology Conference,

Tampa, Florida, March 20-22, 1985, p.

1 99.

This paper deals with the instrumentation and design equations for several

systems used to generate calculable

electric (E) and magnetic (H) fields for

electromagnetic compatibility (EMC)

testing. These "standard" electromagnetic (EM) fields with known magnitude

are used to: (a) test the susceptibility of electronic equipment to radiated

fields, (b) calibrate E and H field

probes for measuring and mapping fields,

and (c) ejqjose biological specimens in a known EM environment. The design and

use of so-called transverse electromagnetic (TEM) cells terminated in their

characteristic impedance are described

elsewhere,

[Contact: (303) 497-3540]

Ma, M.T., Kanda, M., Crawford, M.L. , and

Larsen, E.B., A Review of Electromagnetic Compatibility/Interference Measurement Methodologies, Proceedings

of the IEEE, Vol. 73, No. 3, pp, 388-

411 (March 1985) .

This paper presents a review summary of

radiated emission and susceptibility

measurement methodologies currently used

for assessing the electromagnetic com- patibility/interference (EMC/EMI) characteristics of electronic devices and

systems. In particular, measurement

methods using open sites, transverse

electromagnetic (TEM) cells, reverberating chambers, and anechoic chambers are

discussed, in the light of their technical justifications and bases, their

strengths and limitations, and interpretation of the measurement results.

[Contact: (303) 497-3800]

Wilson, P.F., and Ma, M.T., ShieldingEffectiveness Measurements with a Dual

TBt Cell, IEEE Transactions on Electromagnetic Compatibility, Vol. EMC-27,

No, 3, pp. 1 37-142 (August 1985),

Small- aperture theory is used to investigate the dual transverse electromagnetic (TEM) cell. Analyzing coupling

through an empty aperture versus a loaded aperture leads to a simple model

of dual-TEM-cell material shieldingeffectiveness (SE) measurements. Experimental data are compared to theory with

good agreement in the case of an empty

aperture. Some of the difficulties in

analyzing a loaded aperture are discussed.

[Contact: (303) 497-3842]

1986 CEEE Calendar

22-23 April (Gaithersburg, MD)

Workshop on Test Procedures for Precisi<m Instrumentation and ATE Systems.

This Workshop is intended to provide a forum for the exchange of information

among researchers, users, manufacturers,

testing companies, and calibration laboratories on the procedures used in

testing the performance of precision

instrumentation and automatic test

equipment systems. Technical topics

planned include first-article and acceptance testing, bid-sample testing, maintenance and calibration testing, developing and writing specifications and

procedures, "minimum-use" specifications, test accuracy ratios, economic

tradeoffs of testing, case histories of

specific test programs, optimum calibra-
Page 1

CEEE Technical Publication Announcements - April 86

1 986 CEEE Calendar , cont'd.

tion strategies, and recommended practices. Ihe Workshop proceedings will be

published by the Institute of Electrical

and Electronics Engineers.

[Contact: John R. Sorrells, (301) 921-

2727]

23-27 June (Gaithersburg, MD

1986 CPEM (Conference on Precision Electrcxnagnetic Measurements). CPEM 86 is

oeing sponsored by the U.S. National

Bureau of Standards, the IEEE Instrumentation and Measurement Society, and the

Union Radio Scientifique Internationale.

The Conference will present papers cov- ering the theory, design, performance,

simulation, and application of electromagnetic standards, measurements, techniques, instruments, and systems. Sessions are tentatively planned to cover

the following technical areas: electromagnetic-related fundamental constants

and standards; direct current, lew frequency, and radiofrequency; time, time

interval, and frequency; antennas and

fields; microwaves and millimeter waves;

infrared, visible, and ultraviolet radiation; lasers; electro-optics and fiber

optics; cryoelectronics; automated measurements; and technical calibration

services. The Conference language will

be English. [Contact: Sara Torrence,

(301) 921-2721. (For technical information, contact John R. Sorrells, (301)

921-2727 or Norman B. Belecki, (301)

921-271 5. ) ]

9-10 September (Boulder, CO)

Symposium on Optical Fiber Measurements.

This fourth biennial Symposium is

devoted to measurements on optical

fiber, related components, and systems.

It is sponsored by NBS in cooperation

with the IEEE Optical Communications

Committee and the Optical Society of

America and is intended to provide a forum for reporting the results of

recent measurements research and for

evaluating these results in terms of

future directions. About one-quarter of

the sessions will be workshops led by

invited panelists. Summaries of

presented papers will be published in a technical digest to be distributed at

the Symposium.

[Contact: Susie A. Rivera, (303)

497-5342]

RBCEIiTLT ISSUED

STANDARD REFERENCE MATERIALS

The first practical superconducting

standard reference material (SRM) has

been released by the Electromagnetic

Technology Division to the NBS Office of

Standard Reference Materials for sale to

the public. The certified parameter of

SRM 1457, Superconducting Critical Current — NbTi Wire, is critical current

at magnetic fields of 2,4,6, and 8 tesla

at a temperature of 4.2 K and an electric field criterion of 0.2 uV/cm.

Information is given to permit the user

to determine critical current for temperatures in the range 3.90 to 4.24 K

and electric field criteria from 0.05 to

0.2 pV/cm.

SRM 1457 consists of a 2.2-m length of a multif ilimentary , ni obi urn- t i tani urn , copper-stabilized wire, wound in a single layer on a spool having a core diameter of 8.7 cm. The wire is evaluated

for 34 parameters relating to current,

voltage, magnetic field, temperature,

strain, and physical specimen characteristics.

In conjunction with ASTM Standard Test

Method B7 14-82, D-C Critical Current of

Composite Superconductors, the new SRM

is intended to provide means for calibrating apparatus used to measure k«?y

parameters of superconductor products

and thus should be useful to buyers and

sellers of superconductors, users of

superconducting equipment, and r**- searchers in superconducting technology.
CEEE Technical Publication Announcements - April 86 Page 1

CEEE SPONSORS

National Bureau of Standards

Department of Commerce NOAA

Department of Defense

Defense Advanced Research Project

Agency; Comhined Army/Navy/Air Force

Calibration Coordination Group;

Defense Nuclear Agency; National

Security Agency

U.S. Air Force

Bolling Air Force Base; Hanscom

Field; Newark Air Force Station;

Rome Air Development Center; Space

Division; Wright-Patterson Air Force

Base

U.S. Army

Aberdeen Proving Ground; Aviation

Research and Development Command;

Fort Monmouth; Harry Diamond

Laboratories; Fort Belvoir;

Redstone Arsenal; Materials and

Mechanics Research Center

U.S. Navy

Aviation Logistics Center (Patuxent

River); Naval Air Systems Command;

Naval Surface Weapons Center; Naval

Weapons Support Center (Crane);

Office of Naval Research; Naval

Research Laboratory

Department of Energy

Qiergy Systems Research; Fusion

Energy; Bonneville Power

Administration

Department of Justice

Law Enforcement Assistance

Administration

Charles Stark Draper Laboratory

Electronics Industries Association

Food and Drug Administration

Hughes Aircraft Company

International Copper Research

Association

International Telecommunications

Satellite Organization

Massachusetts Institute of Technology

Sandia National Laboratories

University of California Los Alamos

Scientific Laboratory
NBS-114A (REV. 2 - 80 ) U.S. DEPT. OF COMM. 1 . BIBLIOGRAPHIC DATA

SHEET (See instructions)

4. TITLE AND SUBTITLE

PUBLICATION OR

REPORT NO.

NBSIR-86/3366

2. Performing Organ. Report No. 3. Publication Date

April 1986

Center for Electronics and Electrical Engineering Technical Publication Announcements

Covering Center Programs, July - September 1985 with 1986 CEEE Events Calendar

5. AUTHOR(S)

E. Jane Walters, compiler

6. PERFORMING ORGANIZATION (If joint or other than NBS, see instructions) 7. Contract/Grant No. national bureau of standards

DEPARTMENT OF COMMERCE 8. Type of Report & Period Covered

WASHINGTON, D.C. 20234

July-September 1985

9. SPONSORING ORGANIZATION NAME AND COMPLETE ADDRESS (Street. City. State, ZIP)

U. S. Department of Commerce

National Bureau of Standards

National Engineering Laboratory

Center for Electronics and Electrical Engineering

10. SUPPLEMENTARY NOTES

All technical information included in this document has been approved for

publication previously.

Document describes a computer program; SF-185, FIPS Software Summary, is attached.

11. ABSTRACT (A 200-word or less factual summary of most significant Information. If document Includes a significant

bibliography or literature survey, mention it here)

This is the sixth issue of a quarterly publication providing information on the

technical work of the National Bureau of Standards Center for Electronics and

Electrical Engineering. This issue of the CEEE Technical Publication Announcements covers the third quarter of calendar year 1985.

12. KEY WORDS (Six to twelve entries; alphabetical order; capitalize only proper names; and separate key words by semicolonsf

antennas; electrical engineering; electrical power; electromagnetic interference;

optical fibers;

semiconductors; superconductors

13. AVAILABILITY 14. NO. OF

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Unlimited

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KEY CONTACTS:

Center Headquarters (720) Director, Mr. Judeon C. French (301) 821-3357

Deputy Director, Mr. Robert I. Scace (301) 821-3357

Electrosystems Division (722) Chief, Dr. Oskare Petersons (301) 821-2328

Electromagnetic Fields Division (723) Chief, Mr. Charles K.S. Miller (303) 487-3131

Electromagnetic Technology Division (724) Chief, Dr. Robert A. Kamper (303) 487-3535

Semiconductor Electronics Division (727) Chief, Dr. Kenneth F. Galloway (301) 82 1-354 1

INFORMATION:

For additional information on the Center for Electronics and Electrical Engineering, write or call:

Center for Electronics and Electrical Engineering

National Bureau of Standards

Metrology Building, Room B-358

Gaithersburg, MD 20099

Telephone (301) 921-3357