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UNITED STATES EPARTMENT OF )MMERCE

iUCATION

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NBS TECHNICAL NOTE 623

U.S.

I EPARTMENT

OF

:OMMERCE

National

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5153

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Invariance of the Cross Ratio Applied to

Microwave Network Analysis
NATIONAL BUREAU OF STANDARDS

The National Bureau of Standards 1 was established by an act of Congress March 3, 1901. The Bureau's overall goal is to strengthen and advance the Nation's science and

technology and facilitate their effective application for public benefit. To this end, the Bureau conducts research and provides: (1) a basis for the Nation's physical measure- ment system, (2) scientific and technological services for industry and government, (3) a technical basis for equity in trade, and (4) technical services to promote public safety. The Bureau consists of the Institute for Basic Standards, the Institute for Materials Research, the Institute for Applied Technology, the Center for Computer Sciences and

Technology, and the Office for Information Programs.

THE INSTITUTE FOR BASIC STANDARDS provides the central basis within the United States of a complete and consistent system of physical measurement; coordinates

that system with measurement systems of other nations; and furnishes essential services leading to accurate and uniform physical measurements throughout the Nation's scientific community, industry, and commerce. The Institute consists of a Center for Radiation Research, an Office of Measurement Services and the following divisions: Applied Mathematics—Electricity—Heat—Mechanics—Optical Physics—Linac

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and effective utilization of automatic data processing equipment; and serves as the principal focus within the executive branch for the development of Federal standards for automatic data processing equipment, techniques, and computer languages. The Center

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THE OFFICE FOR INFORMATION PROGRAMS promotes optimum dissemination and accessibility of scientific information generated within NBS and other agencies of

the Federal Government; promotes the development of the National Standard Reference Data System and a system of information analysis centers dealing with the broader

aspects of the National Measurement System; provides appropriate services to ensure

that the NBS staff has optimum accessibility to the scientific information of the world,

and directs the public information activities of the Bureau. The Office consists of the following organizational units: Office of Standard Reference Data—Office of Technical Information and

Publications—Library—Office of International Relations.

1 Headquarters and Laboratories at Gaithersburg, Maryland, unless otherwise noted; mailing address Washington, D.C. 20234.

2 Part of the Center for Radiation Research.

3 Located at Boulder, Colorado 80302.

4 Part of the Center for Building Technology.
..:.-„- ,JKi

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Invariance of the Cross Ratio Applied to

Microwave Network Analysis

R W. Beatty

Electromagnetics Division

Institute for Basic Standards

National Bureau of Standards

Boulder, Colorado 80302

t • '

.,< °\S

X •fr,^P

U.S. DEPARTMENT OF COMMERCE, Peter G. Peterson, Secretary

NATIONAL BUREAU OF STANDARDS, Lawrence M. Kushner, Acting Director

Issued September 1972
National Bureau of Standards Technical Note 623

Nat Bur. Stand. (U.S.), Tech. Note 623, 26 pages (September 1972)

CODEN: NBTNAE

Issued September 1972

For sale by the Superintendent of Documents, U.S. Government Printing Office (Order by SD Catalog No. 013.46:623).
INVARIANCE OF THE CROSS RATIO APPLIED TO

MICROWAVE NETWORK ANALYSIS

by

R. W. Beatty

ABSTRACT

The historical background and theory are given of the

application of the mathematical principle "invariance of

the cross-ratio" to microwave network analysis. Further

developments to improve the accuracy of automatic network

analyzers are suggested.

Key words: Admittance, anharmonic ratio; automatic network analyzers; cross ratio; impedance; microwave network

analysis; reflection coefficient; scattering coefficient.

1. INTRODUCTION

It is well-known that the cross-ratio (or anharmonic ratio) of four

distinct points in' a complex plane is unchanged when these points are bilinearly transformed to four other points [l]. This principle has found

use in a number of microwave measurement problems such as the

determination of efficiencies of bolometer mounts [2], the determination

of scattering coefficients of 2-ports [3], and in the measurement of

reflection coefficients using computer controlled automatic systems [4].

It is anticipated that this technique will be further explored and

exploited, especially with regard to the analysis and evaluation of errors

in automatic network analyzers. The purpose of this paper is to present

a historical background and foundation for these anticipated developments.

1. Such work has already begun [4], but more will surely follow.
2. THE PRINCIPLE

The principle of invariance of the cross ratio is briefly illustrated

as follows.

Consider the linear fractional transformation

z = a w + b

c w + d

(1)

where z and w are complex variables, and a, b, c, and d are complex

coefficients.

As shown in figure 1, four points in the w -plane are transformed by

eq. (1) into four other points in the z -plane.

W-PLANE

( VW

4

)

Figure 1. Four points in the w -plane transformed into four

other points in the z -plane.
According to the principle of invariance, the cross-ratio of the w' s

is equal to the cross -ratio of the zs, or

(zi - z3 ) (z3 - z4 ) (wi - w2 ) (w3

- w4 ) (z2

- z3 ) (z4- zx ) (w2- w3 ) (w4

- Wi)

(2)

The validity of eq (2) has been demonstrated for example in [lj.

3. DETERMINATION OF BOLOMETER MOUNT EFFICIENCY

Kerns [2] represented a bolometer mount as a 2-port as shown in

figure 2.

W

Figure 2. Representation of a bolometer mount by a 2-port.

He expressed the cross -ratio equivalence as follows

(Z - Z3 ) (ZS

- Zj) _ (w - w3 ) (w5 - Wi)

(z - Zi) (z3 - z2 ) (w - wx ) (w3

- w2 ) (3)
Kerns solved for the coefficients a, b, c, and d in eq (1) and then

determined the efficiency T) for the condition w = w . He obtained

a = a>(z3 - rzx ) b = ff(rziw3 - Z3W1)

c = Q^l - r)

d = ff(rw3 - Wi) , (4)

where a = [r(w3 - Wi) (z3

- zi)]~ 2

, (5)

r

= (w5

- Wi) (zg - z2 ) ^ (z2 - zx ) (w3 -w2 )

' < 6 )

and ad - be = 1. (7)

Equations (5) and (7) are valid when reciprocity holds for the 2-port.

Further, the efficiency T^ when w = w is

T! COS

'lo = — ^ . - ' N cos (8) (9 + 0)

where Wo = | Wo I ej9

,

N eJ0

= (a + —) (cwo +d)",

Wo

and

where * denotes the complex conjugate.

In the above analysis it was assumed that zi, z2 , and z3 were

measured corresponding to known values of wi, w2 , and w3 respectively.

One could then determine a, b, c, and d, assuming reciprocity. Finally, a value of wo of load impedance was chosen for which a corresponding

efficiency T) was calculated.
The above results could also have been obtained without using the

principle of the invariance of the cross ratio. One could have instead

solved three simultaneous equations similar in form to eq (1).

4. DETERMINING IMPEDANCE MATRIX OF A 2- PORT

The impedance matrix elements of a 2-port are defined by

vi = zn ii + z12 i2

V2 = z2i k + Z22 ^ >

where the z' s are impedances, and the v* s and i' s are voltage and

currents in accordance with the conventions shown in figure 3.

(9)

vs = - is zl

•i2 zu = Zgx ii + z22 i2

Figure 3. Conventional directions for voltages and currents

associated with a 2-port.

We can write

zi

vi

= ZU

gig Zgi ZUZ L + (ZU Z^ - Z l2 Z21 ) Z2S + ZL Z L + Z22 (10)
This is of the same form as eq. (1), where w = z3 , a = -Z\\,

b = det z, c = 1, and d = z22 . If we determine a, b, c, and d by the

procedure used by Kerns, then

zxi = a, Z22 - d, and z12 z21 = - (ad +bc) (11)

Alternately, one could solve three simultaneous equations, each

similar to eq (10), and obtain the elements of the impedance matrix.

5. DETERMINING SCATTERING COEFFICIENTS OF A 2- PORT

The elements of the scattering matrix for a 2-port are defined by

bx = su ai + si2 a2

b2 = s2i a. x + s22 a2 ,

(12)

where the s' s are scattering coefficients, and the a' s and b

1 s are

respectively the incident and emergent voltage wave amplitudes in

accordance with the conventions shown in figure 4.

1 2

a n < b. h

a

1 a

2

I

2-PORT

D

2

Figure 4. Conventional directions for incident and emergent

voltage waves associated with a 2-port.
The scattering coefficients could be determined given the

elements of the impedance matrix from published [5] conversion

formulas. However, it is usually more convenient to measure the input

reflection coefficients corresponding to three given terminating reflection

coefficients. One will obtain three simultaneous equations of the following

form

Fi = rn TL + rig

T21 TL + 1-22 (13)

where the P s denote the terminating reflection coefficients and the r

1 s denote wave cascading coefficients [5]. The scattering coefficients are

related to the wave cascading coefficients as follows

r22

rl2 det r

- r21

Since eq (13) is of the same form as eq (1), one could follow Kerns

procedure to obtain the r- coefficients, then solve for the s" s. Alternately, one could solve three simultaneous equations of the fo

(14)

rm

r\ = Sll +

Sl5 Ssl Tl

i - s22 rL (15)
to obtain the s' s. This was done [3] and the results were

rL1 rLg rL3 (T\ - ra ) +^3^ (ra- r3 ) + rL3 rL1 r2 ( r3- r\) rL i rL 2 ( ri - ra ) + rL2 rU3 ( ra

- r3 > + rL3rL1 ( r3- r\) ' {Lb)

and

[li (ia - r3) + rL2 (£3 - r\) + rL3 (r, - ra > rL1 rL2 (rx - r2 ) + rL2 rL3 (r2

- r3 ) + rL3 rL1 (r3 - rx ) (17)

(i\ - ra ) (Tg - r3 > (r3

- r,) (rL1 - rL2 )(rL2 -rL3 )(rL3 - rL1 > 312 SS1 " ' [rL1 rL2 (ri - ra ) +rL2 rL3 <ra

- rs) + rL3 rL1 <r3 - fT)T

(18)

All of the results obtained so far could have been obtained without

using the principle of the invariance of the cross ratio. It has been

employed for convenience. In the following, it is even more convenient

because four or more simultaneous equations must otherwise be solved.

6. DETERMINATION OF VOLTAGE REFLECTION COEFFICIENT

Consider a linear circuit representing a measuring instrument and

an object under test whose voltage reflection coefficient is to be

measured. Such a circuit is shown in figure 5.

INDICATOR

KNOWN

STANDARD

MEASURING

INSTRUMENT SOURCE

OBJECT

UNDER

TEST

Figure 5. Representation of measuring instrument and objects

to be measured.
Suppose that the response of the measuring instrument as observed at

the indicator is represented by V, a complex number. It is linearlyrelated to the reflection coefficient T of the object to be measured by the

equation3

V= AF+B , (19) c r + d

v 7 '

where A, B, C, and D, are coefficients whose values are independent of

V and r.

It follows that the cross -ratio of the V s,{V] equals the cross -ratio

of the P s,{r}. Thus

(v, - v.) (Va - v4 ) = ih - ra) ( r3 - r4 ) { (va

- v3 ) (v4- vx ) (r2 - r3 ) (r4 - rx ) Uj l

'

If ri5 T2j and T3 correspond to three known standards, and we

measure Vx , V2 , V3 , and V4 , then we can solve for F4 as follows.

T „t r (Vi - va )(v3 - V4)(r5 - r3 ) r3 - r4 , (va

- v3 ) (v4- vx ) (r, - r2 ) " r4- ri

{6l)

Then r4 = —j— • (1 +r -JA- ). (22)

1 + r ra

2. This is generally true for any linear measuring instrument for any

type of voltage response. For example, V may be the complex ratio of

the voltage wave outputs of two directional couplers, one coupling to the

forward going wave, and the other to the wave reflected from the load [6].
The three known standards may be chosen in a number of ways,

depending upon what is convenient and available. Some of the choices

that might be considered are shown in Table I. In the table,

sequence Al corresponds to the general case described above, where

the voltage reflection coefficients of the three known standards are

designated as r sl , r S2, and r s3 .

TABLE I. VARIOUS SEQUENCES FOR CONNECTING THREE

STANDARDS THEN THE UNKNOWN

ORDER OF

CONNECTION

SEQUENCE

A 1 B 1 C 1 Dl E 1

1 r.i e^ - 1 - 1 1

2 l s 2 e

je2

1 1

3 r s3 ej93 r s r s

4 Tu Tu Tu Tu Tu

The solutions for Tv corresponding to the sequences in Table I are

as follows.

r Ai r sl + r s3 Tu = rAi + 1 (23)

where r A1 = {V} A1 s3 r s3 - Tu r s i ~ ^ s 2 ru -T si

and fVl ) (Vi - Va) (Va - Vu) ) 1 ]A1 " ) (Va

- V3 ) (Vu - Vx)

J

10
J6i , J y3

,; 1 = JSlS ±JL_

TBI

lU - + 1

je2 je3

r e

" where rBi = I Vj B1 rr rr—

e

jQl

- ej6s

Note that only one standard, a sliding short-circuit is required for the

above technique using eq. (24) and the Bj sequence of table I. Its positions

in terms of the guide wavelength must be accurately determined. It is

convenient to choose equi- spaced positions so that rB i = { V"}bi •

ru = ^

s x

~ rci (")

1 + r cl

where r ci- iV} C 3

i - r s (-2)

Fu "

1 +

Dl (26)

Dl

where rD1 = -^ [V] Dl

Tu =

rE1 +J* ' ( Z? ) rE1 + 1

where r E1 = -{V} E i

' T s

.

Other formulas may be obtained using the cross ratios shown in the

Appendix.

11
In sequence Bl, the first three conditions could be closely realized

by sliding a short-circuit to three positions inside a waveguide. In

sequences CI and Dl, the first two conditions might be closely realized

by connecting first a flat plate short-circuit, then a quarter -wavelength

short-circuited section of waveguide. In sequences Dl and El, a non- reflecting termination (T = 0) can be closely realized by means of an

adjustable sliding termination [7]. Note that the first two conditions in

sequences CI and Dl might also have been closely realized by using

first a flat plate short-circuit, then inserting a quarter -wavelength

section of waveguide.

The sequences in Table II are based upon the following technique.

If one inserts a quarter -wavelength section of waveguide between the

unknown and the output port of the measuring instrument, we obtain the

reflection coefficient - Tu

. Then it is necessary to connect two

additional known standards in order to determine a cross -ratio. (We

could alternately connect one standard directly, then insert a quarterwavelength section of waveguide. )

Table II shows a number of sequences which might be chosen, using

this quarter-wave technique.

12
TABLE II. VARIOUS SEQUENCES FOR CONNECTING ONE OR TWO

STANDARDS THEN THE UNKNOWN USING A QUARTERWAVE TECHNIQUE.

ORDER OF

CONNECTION

SEQUENCE

Ml Nl Ol P 1 Ql Rl

1 r.i -r s - 1 1 -rs r s

2 r1 S2 r s 1 r s

3 -Tu -ru -ru -Fu -Tu

4 Tu Tu Tu Tu Tu Tu

As Townsend [l] has noted there are 24 possible variations of each

sequence shown, of which only 6 give different cross-ratios. It is

further noted in the Appendix that 3 of the 6 are reciprocals of the other 3,

Thus we need consider only 3 variations Mlf M2 , and M3 , of the M

sequence, for example. The cross-ratios of the V s are given in the

Appendix for 3 variations of each sequence. It turns out that the crossratio of the 3rd sequence in each case is the most interesting from our

point of view.

13
The solutions for Ty corresponding to the sequences M3, N3, 03,

P3, Q3, and R3 (See Appendix) are as follows3

:

U = ({v}7s- 1 ' " " ""

' r„ = ± [v} M 3 + i . r sl - r ss Vf

[v} M3 + i r d - r. B [v} M3 - 1 2

)' + r cla. rl s2

1 + V(V} N 3 . r

1 - V (V} N ; lu = pi=^. [ s> or = 1 1 - >J {V} N3 1 +V [V} N;

r R . (29)

It is worth noting that if T s - r\j , then {v} N3 - 0, as can be seen from

eq. (24A), and errors in measuring {v} N3 produce small errors in

determining Ty using eq. (29).

Tu

Tu =

To =

+ VT7]

- vTvi

V} P3 + 1

—03 1

» or = — [V}o.

03 1 + VTv}03

V}p3 - 1

- [Vl Q3 + 1v}q3

+ [v] R3 - [v] R3

(30)

(31)

(32)

(33)

3. As can be deduced from the A3 sequence in the Appendix, one obtains

the M3 sequence by interchanging the order of r s2 and - Tu in the M 1 sequence.

14
In one application [4] the reflection coefficient FT of a sliding

termination was first measured using an "O" -sequence. (Note that Tu in "O" -sequence corresponds to rT ). Then the sliding termination was

fixed and used as a known standard having a reflection coefficient F s in

a "C"- sequence to determine the Tu of an unknown. The sliding loads

and sliding short-circuits used in this technique are either commercially

available or easily fabricated.

So far, it has been taken for granted that both magnitudes and phases

of the V s and P s are determined. However, it is possible to extract

only the magnitudes |zu|> |yu|, and | Tu | with more limited information.

If we can measure only the magnitudes of ratios such as

Vi - v5 v2 - v3

using for example a two-channel nulling system [8], we can then

determine the magnitude of a cross -ratio [v]. If we use the quarterwavelength technique described by Little and Ellerbruch [8], we will

obtain V s corresponding to P s of - 1, 1, - Tu , and fy . We can then

measure [V], As shown in the appendix, this will give us'

|i- yu| 2

, |i-zu| 2

, kul 2

, or

1 " Yu

directly,

depending upon what order we use in connections. The determination of

| r\j I by this technique is also possible but involves more data taking and

calculation. If we denote [V}o2 to correspond to one order of

P s [- 1, 1, Ty, and - Ty ], and we denote [V 7 } to correspond to another

order of P s [-1, Tu , 1, - Fy], then we can write

4. Here, and in the Appendix, zy and yy denote, respectively,

normalized impedance and admittance, such that Ty = —— = —— v zy + 1 1 + yy

15
4/77~"i {

,vio5 i \ M \i+i{v}o 7 i ;

|ru| s = — (34)

This is more complicated than the procedure described by Little

and Ellerbruch [8], but it requires no approximations and holds for a non-ideal system.

An alternate technique is indicated following eq (3 0A) in the appendix.

7. TOPICS FOR FURTHER RESEARCH

There are immediate steps which can be taken to improve the

accuracy of measurements with automatic network analyzers, and future

steps which will require more research.

Present calibration procedures employing short circuits assume

losslessness. A small improvement in accuracy can be immediately

realized by taking losses into account. One can employ quarter-wavelength short-circuits [9] and can also correct for losses in quarterwavelength sections of waveguide.

It appears likely that greater improvements in accuracy might be

realized by choosing different sequences than have been employed. One

would guess that sequences employing standards in which r s was not

greatly different than Iu might have lower errors. This was noted in

connection with eq. (29), for example.

16
Thus, further research is needed to determine how given errors in

measuring the V s and in determining the P s of the known standards

propagate in using different sequences. More research is also needed to

develop suitable standards having | P | ' s intermediate between zero and

unity.

8. ACKNOWLEDGEMENT

Helpful discussions with D. M. Kerns, W. E. Little, B. C. Yates,

and D. A. Ellerbruch are gratefully acknowledged.

17
9. APPENDIX

In the following, three forms for the-cross ratio {V} are given for

each sequence listed in Tables I and II. All of the forms listed can be

considered as special cases of {V} A

-

The order in which the sequences are taken are listed below

[v} A1 [v} A2 [V} A3 {v} A4 {V} A5 [V} A6

r sl r sl r sl r si r^ Tsi r s2 r s2 r s3 Tu r s3 Tu r s3 Tu r S2 r s3 Tu r S2

Tu r s3 Tu r s2 r s2 r s3

Note that

[v}a^T^7 (1A)

{V} A5 - TvTA2 (2A)

{V} as - WTA3 (3A)

In view of the reciprocal relationships above, only the first three

forms are required.

18
(V}A1 = l

sl ~[ SS j> ' I" (4A)

[v} As = r

sl " r

s5

' r

U " r

s3 (5A > 1 s 2 ~ l U

J s3 -i sl

1VJA3 = -f f

' T f ( 6A ) 1 s3--L S2 L

l> _i si

As noted above, the following forms are all special cases of {V}aJ«l - J«2 J«3 r {v3-^r^er-t—IiT

(7A > e - e lu - e

{V}B2 = -5- e— \ e— (8A)

J°2 " r J y3 J«l

e 1 u e - e

J6i jQs je2

e - e ly - e

The above expressions simplify if 63

- 92 = 9 2- 6i

tv ^=

T

^

7

- ifT^ = ±^^ (10A)

^= T^- iki^r=^^L < 11A>

{V} ra = f^. \^~-^ (12A)

1 - 1 a 1 + lu Zu

The latter sequence appears attractive for measuring Zu

.

19
[v} D1 = YTr" = l " yu {13A)

[V} D2 =

" 2r" = 1 - Zu (14A)

1 - 1 u

£v} D3 =YTru = yu (15A)

The latter sequence and the one giving the reciprocal cross-ratio are of

interest in determining yu , zu , | yu | , and | zy J -

(v} E1 = r

r;/

r" =-r^ < 16A>

1 s ( 1 - lu ) z s - 1

[V} E2 = /»- ri = -3*-^ (17A)

lu (i - r s ) zu - i

{v5 » t^HtS" i^f < 18A>

{v}M1 = r a

I j> r

2r" r (19A)

1 S2 + l U J- si ~ ! U

[V}M2 = ?> ~ I

s3 r ZT

+\ (20A)

1 U _i s2 J-U'" i sl

{v}„ 3 = j> t 5 r

e3

'r

u (21A)

tvj«i - , r4r

;

rr% = (z" s,: 'J

{z

i~ u < 22a> (Tu + r s )2 (Zu z s - l)s

20
TM- ia° "';"-l :i""

tv} - -.0^7 )"

= (

J^ri

r)

3

< 24A>

4r, {v]- =-nrtF = 1 - yu

" (25A)

[V} 02 =

(1

"_

4

ru)

3 = 1 - zu

2 (26A)

V

i + ru J

(V}03 = | * " 1

U

I = Yu

2 (27A)

The latter sequence and the one giving the reciprocal cross -ratio are

of interest in determining yu , zu , | yu | , and | zu |

{V} P1 = 2 r

= Zu + 1 (28A)

[V}p 2 =

x +

2 r

= yu + 1 (29A)

r > i + ru [V}P3 = --j ^- = -zu (30A)

Note that we could obtain | Tu | from the ratio of | {V}q 2 | and ( [V}P1 |

tv}„ =T^V =

(Z

" - 1)(Zs

, + 1) (31A)

1 U + i s Zu Z a - 1

{v}, 2 =T^V = <Z

" - 1)(Z ' + 1) (32A)

21
r r [V]Q 3 = r w = — -r- (33A)

J-s+J-U Z s Z(j - 1

[V } R1

=-^- =

< Z ° - 1)(Zu + 1 > (34A)

1

s - 1 U z s " ZU

fvl - 21% ^ x s _ (z. yz, s -- 1)j.) (zu yz,u + 1) lvj R2 - -= r

- —

r

1 s + *U ZjZ s - 1

22

(35A)

lv} R3 = r r = ZuZs " (36A)

X U - 1 s Zn - z s
9- REFERENCES

[l] Townsend, E. J. "Functions of a Complex Variable", (Henry Holt

and Co. , New York, New York, 1915), pp. 178-182.

[2] Kerns, D. M. , "Determination of Efficiency of Microwave

Bolometer Mounts from Impedance Data, J. of Res. of NBS,

42, 6, 579-585. (1949).

[3] Beatty, R. W. and A. C. Macpherson, "Mismatch Errors in

Microwave Power Measurements, Proc. I. R. E. , 41, 9,

1112-1119 (1953).

[4] Davis, J. B. et al, "3700-4200-MHz Computer -Ope rated

Measurement System for Loss, Phase, Delay, and Reflection",

IEEE Trans, on I & M

2J_, 1, 24-37(1972).

[5] Kerns, D. M. and R. W. Beatty, "Basic Theory of Waveguide

Junctions and Introductory Microwave Network Analysis",

(Pergamon Press, New York, New York, 1967), p. 113.

[6] Engen, G. F. and R. W. Beatty, "Microwave Reflectometer

Techniques", IRE Trans, on MTT, 7, 3, 351-355(1959).

[7] Beatty, R. W. , "An Adjustable Sliding Termination for Rectangular

Waveguide", IRE Trans, on MTT, 5, No. 3, 192-194(1957).

[8] Little, W. E. and D. A. Ellerbruch, "Precise Reflection

Coefficient Measurements with an Untuned Reflectometer, "J. of

Res. of NBS, 70C, 3, 165-168, (1966).

[9] Beatty, R. W. and B. C. Yates, "A Graph of Return loss Versus

Frequency for Quarter-Wavelength Short-Circuited Waveguide

Impedance Standards", IEEE Trans, on MTT, 17, 5, 282-284(1969).

23

f6rmNBS114A"(I-71>

2. Gov't Accession No.

U.S. DEPT. OF COMM.

BIBLIOGRAPHIC DATA

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1. PUBLICATION OR REPORT NO.

NBS Technical Note 623

3. Recipient's Accession No.

4. TITLE AND SUBTITLE

Invariance of the Cross Ratio Applied to Microwave

Network Analysis

5. Publication Date

6. Performing Organization Cod*

7. AUTHOR(S) 8. Performing Organization

R. W. Beatty

10. Project/Task/ Work Unit No. 2721115

9. PERFORMING ORGANIZATION NAME AND ADDRESS

NATIONAL BUREAU OF STANDARDS, Boulder Labs

DEPARTMENT OF COMMERCE

Boulder, Colorado 80302

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Same as Item 9.

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16. ABSTRACT (A 200-word or less factual summary of most significant information. If document includes a significant

bibliography or literature survey, mention it here.) The historical background and theory is given of the application of the

mathematical principle "invariance of the cross-ratio" to microwave network

analysis. Further developments to improve the accuracy of automatic network

analyzers are suggested.

''•KEY WORDS (Alphabetical order, separated by semicolons)

Anharmonic ratio; automatic network analyzers; cross ratio; microwave network

analysis; reflection coefficient, scattering coefficient.

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