UNITED STATES DEPARTMENT OF COMMERCE

C. R. Smith, Secretary

NATIONAL BUREAU OF STANDARDS

A. V. Astin, Director

QUANTITATIVE ELECTRON

PROBE MICROANALYSIS

Proceedings of a Seminar held at the National Bureau of Standards,

Gaithersburg, Maryland, June 12-13, 1967

K. F. J. Heinrich, Editor

Institute for Materials Research

National Bureau of Standards Washington, D.C. 20234

National Bureau of Standards

Special Publication 298

Issued October 1968

For sale by the Superintendent of Documents, U.S. Government Printing Office, Washington, D.C. 20402 Price $3.00
ABSTRACT

A seminar was held at the National Bureau of Standards in June

1967 to examine critically the factors involved in quantitative

electron-probe microanalysis. Major consideration was given to proposed methods for data evaluation, and to requirements for

further work in theory, in measurement, and in the preparation of

standards. This volume contains a series of invited papers which

formed the basis of discussion at the seminar. Topics covered

include corrections for the atomic number effect, for x-ray absorption, and for fluorescence by characteristic lines and the continuum.

The various ways to derive a simplified model of the complex

electron-target interaction are critically analyzed by several authors, and the accuracy of several proposed methods is compared

by error histograms constructed on the basis of hundreds of

analyses of materials of known composition. Applications to the

analysis of biological specimens and to problems of stereometric

analysis are also discussed.

Key Words: Atomic number effect, biological specimens, electron probe microanalysis, electron scattering, fluorescence by the

continuum, quantitative analysis, stereometric analysis, x-ray absorption, x-ray emission.

Library of Congress Catalog CarxJ No. : 68-60068

ii

I

I
FOREWORD

j Development and improvement of measurement techinques for

i the characterization of materials is a prime responsibility of the

Institute for Materials Research of the National Bureau of Stand-

; ards. The Institute carries out this responsibility by serving as a

focal point for the development of measurement methodology and

by encouraging the dissemination of relevant information.

The seminar "Quantitative Electron Probe Microanalysis"

held June 12—13, 1967 and documented by this book is typical of

! meetings held by the Institute at the National Bureau of Standards

I to examine critically an important area of measurement related to

I materials. In this seminar groups of experts were invited to bring

the latest thinking to bear on a problem area of basic importance to materials science.

Kurt F. J. Heinrich of our staff was chairman of the seminar.

Some 25 participants from the United States and five other countries were in attendance. Papers were submitted in advance by the

participants to form a basis for discussion. These papers, with some revisions after the seminar, constitute the subject matter

of this book. Those interested in the refinement of quantitative

measurement in this fruitful field of microanalysis will find this book to be relevant and quite informative.

John D. Hoffman, Director

Institute for Materials Research.

iii

PREFACE

Electron probe microanalysis is extensively used as a research

tool in a wide range of scientific disciplines, including metallurgy,

solid state physics, mineralogy, and biology. Scientists in several

laboratories at locations distributed over the world are seeking to improve our knowledge of the physical bases and the quantitative

aspects of this analytical technique. To stimulate this research,

it is important to establish and maintain free interchange of ideas

among the investigators. It is equally important to render the

results of the research activity accessible to those whose interest

in microprobe analysis is more recent or incidental.

To provide the necessary means of communication among

investigators of quantitative electron probe microanalysis, a

seminar on this subject was held at the National Bureau of Standards,

Gaithersburg, Maryland, in June 1967. The aims and attainments

of the seminar are described in some detail by L. S. Birks in the

Introduction. To assist in the discussion, several participants

prepared papers in advance on those aspects of quantitative

analysis which were of particular interest to them. This book

consists of the discussion papers, brought up-to-date after the

seminar by the authors and the editor. We have also included a

paper by Professor I. B. Borovskii and V. I. Rydnik, who were not

participants in the seminar. Professor Borovskii visited our

Institute a few days after the seminar, and he agreed to contribute

this paper which was translated into English at the National Bureau

of Standards.

In view of the variety of approaches it was logical and desirable

that several subjects should be discussed, in different ways, by

more than one author. In order to conserve the originality of the

contributions, we have endeavored to keep the editorial changes

(including nomenclature) to a minimum. Whatever consensus

can be observed is not due to the pressure of the editor but to the

fact that, at last, an increasing convergence of opinions on the

subject is taking place.

We are indebted to Mrs, Rosemary S. Maddock and to her

co-workers for the editorial assistance which made this book

possible. We also thank Mrs. Mary Ann Morris Giles who very

efficiently took care of local arrangements for the seminar and

participated in the editing of the manuscripts.

CONTENTS

Page

Foreword iii INTRODUCTION 1

Birks, L. S. QUANTITATIVE ELECTRON PROBE MICROANALYSIS: A PROGRESS REPORT 5

Heinrich, K. F. J.

SOME PROBLEMS WITH QUANTITATIVE ELECTRON PROBE MICROANALYSIS 13

Philibert,J.and Tixier, R. THE THEORY OF QUANTITATIVE ELECTRON

PROBE MICROANALYSIS 35

Borovskii, I. B. and Rydnik, V. L

ON THE STRUCTURE OF FORMULAS FOR QUANTITATIVE ANALYSIS 53

Criss, J. COMPUTATIONAL METHODS FOR X-RAY EMISSION FROM TARGETS EXCITED BY ELECTRONS • Brown, D. B.

THE CHOICE OF MODELS FOR ELECTRON SCATTERING AND DECELERATION FOR ELECTRON

PROBE MICROANALYSIS

Mulvey,T.

vii
CONTENTS - Continued

PROGRESS IN THE CORRECTION FOR THE

ATOMIC NUMBER EFFECT

Poole, D. M.

'THE CALCULATION OF STOPPING POWER AND

BACKSCATTER EFFECTS IN ELECTRON PROBE

MICROANALYSIS , Duncumb, P. and Reed, S. J. B. SCATTERING OF ELECTRONS IN METALLIC

TARGETS

Murata, K., Shimizu, R. and Shinoda, G.

ABSORPTION EDGE EFFECTS IN ELECTRON

PROBE ANALYSIS '

Nagel, D. and Criss, J. FLUORESCENCE EXCITED BY THE CONTINUUM . Henoc, J. QUANTITATIVE EVALUATION METHODS FOR

ALLOY MICROSTRUCTURES BY MICROPROBE

ANALYSIS

Dorfler, G.

SOME ASPECTS OF THE MICROPROBE ANALYSIS

OF BIOLOGICAL SPECIMENS

Hall,T.

viii
QUANTITATIVE ELECTRON PROBE

MICROANALYSIS

INTRODUCTION

L. S. BIRKS

Naval Research Laboratory,

Washington. D. C. A seminar on quantitative Electron Probe Analysis was held at the National Bureau of Standards, Gaithersburg, Md., in June 1967.

About twenty experienced people from six countries were invited

for two days of extended informal discussions on mathematical

models for calculations, values of parameters, selection of standards, and measuring techniques. Backgrounds and interests of

the attendees varied from more applied science such as biology,

metallurgy, and mineralogy to the less applied fields of mathe-

; matics, physics, and chemistry.

The objective was for the attendees to bring each other up to date on the most current attitudes and methods in electron probe

analysis in the various countries. The approach was to consider

and discuss questions such as "Where are we today? Where should we be heading? Which areas of work should be given priority? What

are the chances of achieving accuracy of 1% for major constituents

and what improvement in theory or experiment will be necessary to achieve such accuracy?"

Actually, there were no formal presentations made at the seminar

but the papers in this volume were submitted by several of the

attendees as background information for the discussions. They vary

considerably in coverage and approach. Some of them draw to- gether previously published work to present a comprehensive re- view. Others assess the current situation in an area by considering

j the questions rather than giving answers. Still others suggest new

concepts or report new measurements. Unfortunately, the printed

papers cannot recapture the full flavor of the seminar but that would

not be possible even with a direct transcript of the discussions.

Hopefully they will be useful as a guide to the areas covered for those interested parties who could not be present at the seminar.

1
2 ELECTRON PROBE

In the discussions there was no attempt to reach a consensus in J any of the subject areas. However, a few remarks may be made on

| general attitudes: \ 1. The need for dependable experimental measurements ofj

absorption coefficients, fluorescent yields, backscatter coefficients, i ionization cross-sections and other parameters is becoming more

'

critical as more workers come to rely on calculation methods for : quantitative analysis. 1 2. It may be necessary to go back to the physical models andj

examine such fundamental concepts as electron retardation to make

sure the forms and values used are really applicable to electron

probe analysis and to estimate what kinds of errors have been

'

introduced by which approximations. '

3. There are continuing needs for approximate calculation!

methods which can be performed with slide rules or desk calculators as well as for more elaborate computer programs. Attempts should

be made to predict limits of accuracy of the approximate methods by

comparison with the more elaborate calculations for some well

;

chosen types of specimens. | 4. Fluorescence by the continuum has been improperly over- looked or neglected in cases such as Cu-Au where it may change

the calculated composition by three to five percent of the amount

present. Present computer programs make calculation of the

continuum fluorescence feasible when large differences in atomic

number of the components indicate it cannot be neglected.

5. Preparation and testing of comparison standards, both homogeneous and inhomogeneous, should be pursued vigorously to augment and verify the mathematical calculation methods.

6. Valence state and absorption fine structure are of increasing

importance in quantitative analysis of low atomic number specimens

such as biologicals. Parameters for such specimens are more

uncertain than for metals and minerals but fortunately the

acceptable limits of error in quantitative analysis of biologicals are even less stringent. It would be of great interest to investigate if the

valence state in compounds of interest remains unchanged when the

specimen is bombarded by electrons.

Because of the varied interests of the participants, one of the

original objectives was not reached or even approached. That is, there was no agreement on any kind of priority list of problems to be

attacked. The mathematicians left still feeling that setting up more
BIRKS 3

rigorous expressions for absorption, scattering, etc. were the most

pressing problems; metallurgists and physicists still planned

rigorous pursuit of solid-state reactions by experimental means;

chemists still contended that preparation of reliable homogeneous

standards and calibration curves was the first order of business.

Nevertheless, the exchange of views was valuable and informative

and an excellent way to catch up on all phases of quantitative

electron probe analysis.

QUANTITATIVE ELECTRON PROBE

MICROANALYSIS: A PROGRESS REPORT

KURT F. J. HEINRICH

Spectrochemical Analysis Section, Analytical Chemistry Division, National Bureau ofStandards

I. Introduction

Since the appearance of the first publications of Castaing [1,2]

electron probe microanalysis has been applied to an ever increasing

variety of specimens. The energy range of x-rays used in this technique has also been extended considerably. In this process

many difficulties arose in the quantitative determination of the

specimen composition. Hence, many investigators have spent great

efforts to render quantitative microprobe analysis more effective. We hope that the present NBS publication will give the reader a

balanced view of the present state of art as well as of the areas in which further investigations are required.

Solutions to the present problems are sought by a concerted

attack from both the theoretical and the empirical points of view.

Neither of these viewpoints is at present entirely satisfactory.

Theory does not as yet describe unequivocally the electron-target

interaction — and the subsequent x-ray emission — with the

accuracy required for quantitative analysis. Hence, empirical

adjustments are necessary to make models agree with the

experiments. On the other hand, a fully empirical treatment of the

problem is impractical in view of the excessive number of factors

affecting the intensity of x-ray emission from a complex target. The

lack of a sufficient number of reliable standards further hampers the

testing of proposed procedures. However, in view of the progress

made in recent years, it can be expected that, with a sustained effort, the remaining gap between theory and experiment will be rapidly

closed.

It should not go unmentioned that much valuable information can

be obtained in practice through qualitative and semiquantitative

analysis, in particular by applying scanning techniques. This area

has been reviewed elsewhere [3] and will not be considered here.

5
6 ELECTRON PROBE

II. Theory of Quantitative Analysis

Quantitation is based upon the comparison of primary

characteristic x-ray intensities emitted from the specimen and the

standard, respectively. To predict these intensities, we must know

the ratio of the x-ray intensities produced within the specimen and

the standard, respectively, as well as the distributions with depth of

the x-ray generation. Since the ionization cross-sections of the

atomic levels producing the x-ray photons of interest vary with the

energy of the exciting electrons, a workable theory of microprobe

quantitation must provide, in the first place, a quantitative

description of the electron fluxes and energy distributions as a

function of the depth of penetration. (See paper 10, by Murata,

Shimizu and Shinoda.) Diverse aspects of this problem are considered in the communications included in this volume. It is cus- tomary to treat separately the variation of intensities generated

within the specimen as a function of target composition (atomic

number effect). This subject is treated in detail in the papers 3 to 10. The knowledge of the emission distribution in depth permits, in turn, calculating of the attenuation of the emerging radiation.

Therefore (see Philibert, paper 3), we submit the measured emerging

intensity ratios to an "absorption correction" and to an "atomic

number correction". However, as pointed out by Brown (paper 6), this approach, involving two separate corrections to the primary

intensities, might not be necessary in future procedures.

Besides the primary characteristic radiation, the specimen also

emits fluorescent radiation, which may have been excited by both

characteristic radiation of other elements and by continuous

radiation (Bremsstrahlung). The theory of correction for fluorescence excited by characteristic rays [l, 4] is fairly well

known and generally applied although further critical experiments in

this area are desirable. The excitation by continuous radiation,

however, is far more complex [5]. Since the need for correcting for

this effect is now becoming more apparent, its discussion by J. Henoc (paper 12) is a welcome contribution to this publication.

The continuous radiation falling within the spectrometer

acceptance is part of the background which must be subtracted from

the measured intensities. Philibert (paper 3) suggests that care must

be taken in determining the appropriate background level. Critical studies in this area would also be useful.
HEINRICH 7

III. Experimental Support

A. TEST ANALYSES

While many investigators have pubHshed the results of analyses of

presumably well characterized test specimens, Poole and Thomas

! [6, 7] were the first to critically evaluate the effectiveness of diverse

jProposed correction procedures, using a large number of

I measurements performed on such specimens by various

I laboratories. This is extended to an even larger number of test

I specimens and procedures in Poole's present contribution (paper 8). Similar error distributions are also included in Duncumb and Reed's

paper (paper 9). The effective performance of test analyses is a crucial test for any

[proposed analytical procedure; it is difficult, however, to locate

unequivocally the sources of errors by this method. In a study of the

'data used by Thomas [6], Heinrich [8] showed evidence that the

most serious failures are not due to the atomic number correction.

There is a strong indication that significant errors in this group can

be attributed to excessive absorption of x-rays, to fluorescence by

characteristic lines, and to errors in the chemical analysis of some

test specimens. To improve the value of such test analyses, standard

I reference materials of tested homogeneity and accurately determined composition will have to be prepared.

B. PARTIAL TESTS

In view of the complexity of the target events it is important to provide tests that permit the locating of sources of error in the

correction scheme. To cite a few examples, an electron distribution

model that fails to predict the correct values of the electron

backscatter coefficients must be expected to fail to predict the

correct x-ray production as well. Therefore, the improved

knowledge of the electron backscatter coefficients [9, 10] permits

testing such models; an even more sensitive test could be

established if the energy and angular distributions of backscattered

electrons were also redetermined reliably.

It is interesting to note in this context that some theoretical

expressions for the electron backscatter coefficient (e.g., Borovskii

and Rydnik, paper 4) predict a dependence upon the ratio of atomic

weight to atomic number, while other models do not contain a term

involving this ratio. The backscatter coefficients determined

experimentally by Heinrich [lO] exhibit such a dependence, in qualitative agreement with Borowskii's predicfion (Fig. 1).
The most important partial tests are those involving x-ray

emission. These include the following experiments:

a. Determination of the distribution in depth of emitted x-ray

intensities by the tracer method. Most work in this area concerns primary emission [2, 11]; but J. Brown has also studied by this technique the depth distribution of fluorescent emission [12].
HEINRICH 9

b. Determination of absorption of emitted x-rays as a function of

the emergence angle [ 1 , 13].

c. Measurement of secondary emission by the undiffused-couple

I method [14, 15].

j d. Determination of secondary emission caused by the conI tinuum, by the aluminum-layer method [2, 5].

1 e. Experimental determination of the backscatter loss [16].

1 f. Measurement of the variation of x-ray emission as a function of

I accelerating voltage [17].

I These experiments have been indispensable for the establishment

of methods for correcting electron probe measurements. It must be

added, however, that the experimental evidence available at present

I is insufficient from both the qualitative and quantitative point of

j view. The results of some attenuation experiments are available

I only in form of graphs difficult to read with the required precision,

and it is particularly difficult to separate the effects of primary

emission from those of emission by the continuum. There is no

experimental evidence to speak of concerning the fluorescence

excitation of K-lines by L-lines and vice versa, and even the case of

I K-K excitation is not sufficiently documented, so that it is

i impossible to test efficiently the models proposed for this case. Moreover, practically all these experiments were performed on pure

elements, so that the emission from composite targets, observed in the microprobe, can only be calculated using untested assumptions.'

More, and more precisely executed and documented, experiments

will have to be performed to provide more solid bases of comparison

with theoretical speculation.

rv. Errors of Input Parameters

The effects of errors in the input parameters for correction models

have not been fully recognized in the past. An analysis or error propagation in the absorption and fluorescence (by characteristic

lines) corrections was performed recently [18]. This work shows

that uncertainties in the values of x-ray mass attenuation

I coefficients, of the emergence angle, and of the fluorescent yield can

] seriously impair the accuracy of analysis, even if the model itself is

' Furthermore, there is practically no information available concerning the effects of electron beams impinging upon the specimen at an angle other than normal; hence the theory of analysis with such a geometry is not well founded at the present

time.

295-798 0-68^2
10 ELECTRON PROBE

satisfactory.^ In the case of the absorption correction, such effects ) can be minimized by a careful choice of the conditions of the i measurement (i.e., using a high emergence angle and low excitation

| voltages). Similarly, a study of the validity of the assumptions

| frequently used in calculating electron scattering and deceleration is .

still needed. To mention only a few examples, the limitations of

| Bethe's law, particularly at low electron energies, should be i investigated, as well as the effects of uncertainties in the ionization

j cross-sections.

A major difficulty in such investigations is that the necessary | experiments as a rule require delicate and complex specimen i preparation techniques, or x-ray instrumentation other than the I electron probe. The involved expenses in time and money can I hardly be avoided, however, if the proper balance between theory

| and experiment is to be maintained. i

) V. The Application of Electron Probe Microanalysis [ When microprobe analysis is applied to a variety of specimens, we [ find many difficulties not considered in most conventional analytical

[ schemes. New problems arise, for instance, with specimens in which i abrupt concentration changes arise over short distances, such as f inclusions [14, 15]. This problem has been discussed by Philibert

(paper 3). Complications may also arise in non-conductive

specimens, in the analysis of low atomic number elements, and in I cases where chemical effects upon wavelength spectra (wavelength | shifts, band-shape changes) become apparent. The analysis of thin

j films has been recently discussed by Hutchins [19] and by Colby

[20].

Critical studies of the effects of specimen preparation were ! published recently by Picklesimer and Hallerman [21] and by

Yakowitz [22]. Of great interest are also the experiments with | specimen etching performed by Dorfler et al. [23]. These authors j show that under carefully controlled conditions light etching of the

specimen is frequently beneficial, contrary to common belief. The analysis of soft biological tissue is a field of great potential , importance. The special problems of specimen preparation,

measurement, and interpretation of the results are discussed in the

^The communication of Nagel and Criss (paper 1 1) dealing with the uncertainty of mass attenuation coefficients in regions near the absorption edges is an important

contribution in this field.
HEINRICH 11

contribution by T. Hall (paper 14). The questions treated by this author will also be of interest in the analysis of non-biological

organic specimens (plastic material, photographic emulsions,

textiles, etc.). Another area in which further work is needed is the

analysis of particulate material, such as mineral powders and

atmospheric particles.

The contribution of Dorfler (paper 13) deals with quantitative

phase analysis of heterogeneous specimens. This is an aspect of

quantitative analysis which has not been given extensive and

systematic attention until now. Yet, it offers unsuspected new

applications of the microprobe to quantitative metallography and to analogous phase distribution studies in mineralogy.

Instrumental developments which are presently under study will eventually permit the quantitative characterization of an entire

specimen area. Such techniques will combine the characteristics of

quantitative microprobe analysis, of scanning electron probe

I analysis, and of phase analysis. To reach this goal, extensive use of

digital computers will be made in the programming and evaluation of

the analytical experiment. While many difficulties still stand in the

I way to this "total microanalysis", the possibility of such an exciting

i technique should stimulate the investigator in his present efforts.

VI. References

[l] Castaing, R., Doctoral Thesis, University of Paris, 1951.

[2] Castaing, R., and Descamps, J., J. Phys. Radium 16, 304 (1955).

[3] Heinrich, K. F. J., NBS Tech. Note 278, 1967.

[4] Reed, S.J. B., Brit. J. Appi. Phys., 913 (1965).

[5] Henoc, J., Maurice, F., Kirianenko, A., Commissariat a I'Energie Atomique,

Centre d'Etudes Nucleaires de Saclay, France, Report CEA — R 2421

(1964).

[6] Thomas, P. M., Atomic Energy Research Establishment, Harwell, England,

Report AERE — R 4693 ( 1 964).

[7] Poole, D. M), and Thomas, P. M., "The Electron Microprobe", Eds. T. D. McKinley, K. F. J. Heinrich, and D. B. Wittry (J. Wiley and Sons, Inc., New

York, 1966) p. 269.

[8] Heinrich, K. F. J., "Advances in X-Ray Analysis", Vol. 11, (Plenum Press, New York, 1968). To appear.

[9] Bishop, H. E., in "X-Ray Optics and Microanalysis", Eds. R. Castaing, P. Descamps, and J. Philibert, (Hermann, Paris, 1966) p. 153. [lO] Heinrich, K. F. J., in "X-Ray Optics and Microanalysis", Eds. R. Castaing, P. Descamps, and J. Philibert, (Hermann, Paris, 1966)p. 159. [ll] Castaing, R., and Henoc, J., in "X-Ray Optics and Microanalysis", Eds. R. Castaing, P. Descamps, and J. Philibert, (Hermann, Paris, 1966) p. 120.
12 ELECTRON PROBE

[12] Brown, J. D., Doctoral Thesis, University of Maryland, 1966. i [13] Green, M., in "X-Ray Optics and X-Ray Microanalysis", Eds. H. H. Pattee,

'

V. E. Cosslett, A. Engstrom (Academic Press, New York, 1963) p. 361. i [14] Reed, S. J. B., and Long, J. V. P., in "X-Ray Optics and X-Ray I Microanalysis", Eds. H. H. Pattee, V. E. Cosslett, A. Engstrom (Academic

] Press.New York, 1963)p. 317. [15] Maurice, P., Seguin, R., and Henoc, J., in "X-Ray Optics and Microanalysis", ; Eds. R. Castaing, P. Descamps, and J. Philibert (Hermann, Paris, 1966) p. 357. [16] Castaing, R., and Derian, J. C, in "X-Ray Optics and Microanalysis", Eds. R. Castaing, P. Descamps, and J. Philibert (Hermann, Paris, 1966) p. 193. [17] Green, M., in "X-Ray Optics and X-Ray Microanalysis", Eds. H. H. Pattee, V. E. Cosslett, A. Engstrom (Academic Press, New York, 1963) p. 185. [18] Yakowitz, H., and Heinrich, K. F. J., Microchim. Acta (1968) in press.

j [19] Hutchins, G., in "The Electron Microprobe", Eds. T. D. McKinley, K. P. J. i Heinrich, and D. B. Wittry (J. Wiley and Sons, Inc., New York, 1966) p. f 390. I [20] Colby, J. W., in "Advances in X-Ray Analysis", Vol. 1 1 (Plenum Press, New

j York, 1 968). To appear.

j [21] Picklesimer, M. L., and Hallerman, G., U) S. Atomic Energy Commission,

Report ORN L-TM- 1591(1 966). [22] Yakowitz, H., ASTM Tech. Publ. 430, (American Society for Testing and i Materials, Philadelphia, 1963) p. 383. [23] Dorfler, G., Bloch, R., and Plockinger, E., Arch. f. d. Hiittenw. 37, 375 (1966).
SOME PROBLEMS WITH QUANTITATIVE

ELECTRON PROBE MICROANALYSIS

J. PHILIBERT and R. TIXIER

Research Institute of the French Ferrous Metallurgy (IRSID),

-St. Germain-en-Laye , France

Abstract

The main lines of correction calculations are briefly reviewed,

according to the ZAF scheme — where Z represents the atomic

number effect, A the absorption, and F the fluorescence. The atomic

I number correction is discussed in detail and its importance in the case of thin specimens analysis is emphasized.

Electron probe' microanalysis has been frequently considered as

I an absolute method, since it gives directly the mass concentration of

j an element A in a complex target ABC . . .:

with the usual notation.

This relation is of course an approximate one, and the first question which arises is as follows: what kind of intensities are to be

considered in relation ( 1 ) ? A careful distinction has to be made between generated intensities

and emerging intensities. Let us call k.4 the ratio of intensities of radiations (i.e.,Ka)

generated within both targets (specimen and standard)

The theory has to derive the relation between k^ and CaIn Castaing's 'Tirst approximation", the relationship is simply:

I. Introduction

C,=(WI(A)) (1)

k^=(Ul(A)) (2)

(3)

while the Castaing "second approximation" takes the form

(4)

13
14 ELECTRON PROBE

A more exact approximation which may be easily derived, is:

(R/S)

1 p, specimen

(R/S)

(5)1 standard

R is the "backscattering factor" (loss of ionizations due to electron

backscattering) and S is the "stopping power factor". Both factors

depend on the electron retardation law and the ionization cross- section of A atoms. Moreover, R depends on the number and

energy distribution of backscattered electrons.

The second formula to be derived relates the ratio k^ of generated

intensities to the ratio Ka of the intensities J of the radiation

emerging from the specimen and entering the spectrometer

Ka = (J.4/J(A)) (6)

I Two effects contribute to the difference between K,? and k^. First

of all, radiation is absorbed inside the target and secondly,

[ fluorescent radiation is emitted with the same wavelength as the • primary. Relationships (3), (4), or (5) are only valid for primary i emissions.

Thus, the essential features of the calculations may be

summarized as follows:

ratio of ratio of ratio of atomic mass

total fluores- primary absorp- primary number concen- emergent cence emergent tion generated effect tration

intensi- ©

intensi- ©

intensities ties ties © i k.

;

The secondary emissions have to be subtracted from the total measured intensities (K^ k^). The primary emergent intensities have then to be corrected for the absorption effect (k^ —> k^) and

finally the true concentration Ca is calculated from the ratio of

primary generated intensities (atomic number effect).

This sequence may be expressed as the FAZ sequence.

Conversely, by calculating the ratio of emergent intensities from the

known (or assumed) concentrations, the ZAF sequence has to be

followed. "Zafizing" is the usual method of calculation for
PHILIBERT AND TIXIER 15

I establishing theoretical calibration curves, versus Ca or KaICa

! versus Ca (or K^), or K^C.^ versus Kf, while "Fazising" is generally employed for iterative calculations.

The importance of the order of the factors (namely FAZ orZAF)

should be noted. If the calculation stages are expressed as

multiplicative factors, i.e., K = K f ic,)

and so on . . ., the order of calculation is not significant. This is the case of many calculations, mainly with computers when iterative methods are used.

Nevertheless, experience seems to me to show that frequently one of the corrections is more significant than the others and its relative importance appears clearly when the right order of the

sequence is respected. Generally speaking, every time the

calculation cannot directly obey the general scheme, it is necessary

to examine the physical significance of the processes involved, and

the ZAF scheme remains the basis of such a critical investigation. In developing general methods, homogeneous targets are assumed

but in practice this assumption is often not justified. Analyses near boundaries (precipitates, diffusion, layers, . . .) are very frequent,

and a "blind" calculation becomes impossible. Here again a clear

understanding of the physical processes involved (as shown by the

ZAF scheme) is absolutely essential.

I would suggest that the case of non-homogeneous targets has not

yet received all the care it deserves. The correction calculation

method must be generally verified by looking at homogeneous

targets, although platings of A/B type are also very useful from this point of view and can give useful data in connection with absorption

or fluorescence effect: (/)(pz) function, ratio of secondary to primary

emission, etc. . . .). But in practice, the "microprobist" has to deal

with boundaries, precipitates, and so on, so that each new

measurement often appears as a "particular case" and does not

enter the general scheme of calculations for which programs are

available.

From this point of view, the analysis of small particles embedded

j in a more or less amorphous matrix has not yet received sufficient attention. Such is the case for extraction replicas in metallurgy,

foreign particles in biological tissues, .... The quantitative analysis

of such specimens is very crucial in many fields of research; it has

expanded widely with the developments of EMMA and similar
16 ELECTRON PROBE 1

instruments combining electron microscopy and microanalysis, j; General methods of calculation (absorption, atomic number) arej

lacking for such specimens and no precise tests have been made tol determine whether the corrections are negligible or not.

j

II. Discussion I

A. ABSORPTION CORRECTION

The analytical expression for the f(x) functions has been widely

employed for some years, in spite of the drastic assumptions used in

its derivation, even with the "effective cr" improvement suggested'

by Duncumb and Shields. | In the computer age however, the need for simple formulae is not| as acute as during the slide rule period. It is thus to be hoped that thCj

"collective model" on which the formula is based will be

reconsidered in spite of the many difficulties likely to be

encountered. The inaccuracies and the inadequacies of the physical?

laws involved (multiple scattering and diffusion, electron!! attenuation and retardation laws, etc.) have been pointed out in a[ series of papers by Cosslett and Thomas [11].

[ Notwithstanding the rather pessimistic conclusions of these

authors, this description offers nevertheless several advantages, the' most important being that a good derivation of the 4>{pz) distribution' function would enable the Z and A factors to be calculated in a

single step.

B. FLUORESCENCE CORRECTION

I should like to present only two short remarks about these

corrections: \ (a) characteristic radiation: the well known Castaing [8]

formula, with or without the improvements or the simplifications

due to several authors (Birks, Reed, Wittry, . . .), applies first of all to K-K excitation. The case of L-L, K-L, . . .excitations have

perhaps not yet been analyzed with the careful attention required.

For instance, in his general paper. Reed (1965) [17] finally gives a numerical application only in the case of K-K excitation.,

Furthermore, the absence of data on the fluorescence yield and the

absorption jumps, together with the complexity of Coster-Kronig

transitions , seem to frighten off fresh investigation in that field. (b) continuous spectrum: I am afraid that people have too frequently claimed this correction to be negligible, without any^
PHILIBERT AND TlXIER 17

calculations to ascertain the validity of such an assumption. In the case of A/B interfaces, this fluorescence effect is known to be

frequently quite important.

C. ATOMIC NUMBER EFFECT

With the assumption of a continuous energy loss law, the ratio of

Ex quanta (X = K, Lm, . . .) produced in the specimen and the

standard can be written as follows:

dE

dE

Ex ^x(E)

n(A) ~" R(A) r Ex

[dE/dps] 3

1

: where R(A) is relative to pure A standard, to the specimen (for

element A). E is the mean electron energy, Tv(E) the ionization

cross section of the A atoms for the X level, Ea- the ionization energy

for this level. dE/d(ps) is the retardation equation of the electrons in the target, p its specific mass, s the length of the path traversed by

the electrons in the target. The subscripts st and sp are respectively

related to standard and specimen. By using a well known theorem,

this expression can be simplified to:

"a ^ ^A (dE/dps) 3 J, E' = (8)

n(A) R(A) (dE/dps)3p,E"

Since the ratio of stopping powers s = dE/dps is rather insensitive

to the energy E, the second factor on the righthand side may be

calculated for some mean value of the energy, i.e., Ei = (Eo+Ea-)/2.

Whence, with the usual notation:

(n^/n(A)) = C, (R^/R(A)) (s(A)/s,) (9)

or

(n^/n(A)) = (a^CVa) (10)

with

aA = s(A)/R( A) and a = SaIRa

The "second approximation" assumes that 5 = XaA- (11)
18 ELECTRON PROBE

This simplification can hardly be justified, but it works! Of coursej

the a's depend on the incident energy Eo. As used by Poole and;

Thomas, it has been very successful for the analysis of binary aIloys| or compounds.

For a more exact calculation, equation (7) is rewritten:

"a p, Ra/Sa

= 1>A (12)

where

n{A) R(A)/S(A)

/«J/^ (E) dE i, — (13a)

[dE/dpslA f E„ ;

and

TT A /

»Px (E) dE

Sa = / (13b)

[dE/dp sj complex target

E.

The R and S factors have to be calculated for the standard (pure

element) and for the specimen (complex material).

As far as the S factor is concerned, an exact calculation can be

carried out in. both cases by calculating equation (13a) and (13b)

with the help of some analytical laws for ^ and dE/dps.

D. CALCULATION OF S FACTOR'

I Let us consider a target containing elements A, B, C, . . .of atomic masses At, . . .atomic numbers Z,, . . .and mass concentrations C,,...! such that 2 C , = 1 . i Let this target be bombarded with electrons of initial energyj

E„ = e • V„; E.v is the ionization energy of the X level of atoms Aj

We shall study the element A.

See Brit. J. Appl. Phys. (19'68) ser. 2, vol. 1, 685.

I

!

I
PHILIBERT AND TIXIER 19

If dnA is the mean number of ionizations of the X level of the A

atoms produced by the electrons along the path increment ds:

dnx = Ca p ^ ^Pj^ (E) ds

4

Ex

= Ca • X / ^ dE (14)

/ dE/dps

assuming that (dE/dps) is defined and is continuous along the path

and that dnA- might be integrated. N is Avogadro's number. Bethe

(1930) [3] and Bethe, Rose, and Smith (1938) [4] have given the

following expressions for ^ and dE/dps:

a. Ionization Cross Section:

(E) Zx bx log IE (15)

E.Ex Bx

Za-: number of electrons on X level

bx: bA- = 0.35, b/, = 0.25

Ba^=1.65 Ev according to Bethe, but Worthington and Tomlin

(1956) [20J gave a better form for low excitation energy as B y = 4Ea-. We shall take the value of 4Ea for electron probe microanalysis,

where the electron energy is quite small (< 40 keV); we then have

^-»0 when E^ Ex. The bA^ value does not appear in the atomic number effect correction (see later).

E

If U = —— , Uo = —^ (over-voltage ratio)

Ex Ex

(U) = ne' • -i • logU (16)

E^x U
20 ELECTRON PROBE

b. Retardation Equation:

dps U

tzg'nV^ ^ Zi , 1.166 UE^ ..J

J,: mean ionization potential for the i atoms. These equations suppose that the electron energy is high enough;

i.e., E > E,v in equation (15) and U-E.v > J, for all the target atoms ir equation (17).

Let

Ci = M (18):

and

J

^1.166E$^

or

1 7 Z 1 1.166 Ex (\Q)

1 ^ C. fi logW.x

This leads to

dE 2ne^ N

dps U Ex

and from (14)

(20)

MlogU. W (21)'

_N Zx bx / logU

^ A 2 N ^1 M log U W

!
PHILIBERT AND TIXIER 21

Let (1/S) = nA-(A/N)-(l/CA), where (1/S) is a function which can be

used to represent the electron mass stopping effect in atomic

number effect corrections.

Putting X = U-W, we can integrate (1/S) in terms of logarithmic

integral (li) function and we get:

S

2 N M I W

X [li (Uo. W) - li (W;] } (22)

The above equation allows the calculation of (1/S) in any target. In a target made of a pure element, it reduces to an already known

equation (Archard, Mulvey, 1 962) [ 1 ]

.

By assumption, we must have Uo-W > 1. IfW —>1,(1/S) remains

finite as can be seen in the series expansion:

« = ~ (logx)'

li X = C + log I log X I + >

S. S! = 1 C = Euler's constant. The above expression allows the li function

to be easily computed.

l.A Practical Way ofCalculating (1 IS) for a Target ofKnown

I Composition

The terms Wf = (1.166 ExUd can first be calculated. We have

tabulated W,^for all elements of 3^Z^92, taking the ionization

energy Ea for the K level and L level from the tables of Bearden

(1964) [2] and Blochin (1957) [6] (Fig. 1). We have used J/ = 11.5 Z,

which might not be the best form fori (Ex and Ji in eV).

Afterwards one can calculate M (Eq. 18) and log W (Eq. 20).

The assumptions Uo-W^> 1 involve a theoretical minimum value

for Uo, while in practical cases its value will always be greater. As a

I matter of fact, a small value of Wms found for analysis of a light

element in a heavy matrix, hence a low E.v and a high U„.

One can then calculate (1/S). Practically, (Z.Y-bA72N) need not be

calculated as this term vanishes in the correction coefficient. One

then calculates a term ( 1 /S ' ). We have tabulated

(M/S') = Uo-l -(l/W)logW(liU„-W-HW) (23)
22 ELECTRON PROBE

W

Figure 1 . W> = ( 1 • 1 66 E.J 11.5 Zi).

for different values of W and Uo (Figs. 2,3,4) as the table of (M/S'l

values can be used for any target.

2. Applications

The "universal" curves (Figs. 2,3,4) give (M/S') from Uo andW

values. W for an alloy can be calculated from in pure specimens

(Fig. 1 ) , for the element analyzed, according to formula (20).

For instance, in copper-gold alloys where copper (Cu is analyzed, and in copper-aluminium alloys where aluminium (Al Ka)

;

is analyzed, W variations have been plotted against copper!
PHILIBERT AND TIXIER 23

M/S'

Figure 2. M/S' versus U for different W values, 1<U<30.

M/S'

W=l W=l.l W=1.4 W=2 W=3 W=6

Figures. M/S' versus U for different W values, 1<U<6.
24 ELECTRON PROBE

M/S'

10 20 30 40 50

Figure 4. M/S' versus W for different U values.

concentration (Fig. 5). Generally, W is not a linear function of \ composition.

In a copper-gold alloy, using values for the backscattering

coefficient R computed by Duncumb (1966) [14] from Bishop's

| measurements (Fig. 6) and (1/S') values from equation (23), we have ? calculated the correction coefficients

k_

C sample /ffl standard

(24)

for different accelerating voltages and against concentrations

(Fig. 7).

3. Comparison with Other Results

P. M. Thomas (1964) [18] supposes that one may substitute an

average value for the stopping power (dE/dpz) in the range Eo

to E.v and takes this quantity outside the integral (14). Writing

s = (dE/dpz) (different from our S) she assumes that for a specimen

consisting of n elements in concentrations C,

(i) ^ E - {t\ (25)
PHILIBERT AND TIXIER 25

w

Figure 5. W versus copper concentration in copper-gold alloy (copper analyzed) and in copper-aluminium alloy (aluminium analyzed). A linear approximation has

also been traced. R is calculated from Brandt's data on the energy distribution of

electrons backscattered from pure element targets. The values of s she used are taken from the tabulations by Nelms (1956, 1958) [16]

based on the Bethe formula for electron stopping power. The value

of s chosen for estimating the correction is that corresponding to an

energy half way between Eo and E.v. Though Nelms' tables are limited to 10 keV and are not very

practical for use in micro-probe analysis conditions, Thomas' results are interesting to compare with ours since Nelms used for her tables an adjustment for the J variation law, and discussed the validity of

calculations with the Bethe formulae. If we consider a 50-50 copperaluminium alloy in which aluminium is analyzed with Eo = 10 keV, we find with our method {llS)spec.lillS)sian(i. = 1.144 and with

Thomas's method 1.137. The discrepancy is not important in this case. Figure 7 might also be compared with the same computed by

Archard and Mulvey. It should also be interesting to compare the

k/c values obtained here with some others deducted from direct

295-798 0-68—

3
26 ELECTRON PROBE

, iz

0 50 100

Figure 6. R versus Z for different U values according to Duncumb.

calculation of x-ray production by Monte Carlo methods according

to Green (1962) [15] and Bishop (1965) [5].

The analytical forms show that approximation using a "mean

atomic number" in order to have the same calculation with a mixed

target as in pure elements is generally physically unfounded and can

lead to important relative errors. The validity of the present calculation is limited, especially in cases of small over-voltage: by approximation inherent in the Bethe

formulae; by the values of the coefficients we used; and particularly

because we neglect straggling by taking the mean electron energy as parameter (cf. Cosslett, 1964 [9], 1965 [10] and Brown, 1965 [7]).

Since the atomic number effect is more important when the overvoltage is low the present model would need to be refined, using for instance the Walske (1952 and 1956) [19] calculations for extending the validity of Bethe's formula, or adjusting coefficient

and parameter values with experimental measurement (Duncumb

and da Casa).
PHILIBERT AND TIXIER 27

k/c

0 0.5 1

Figure 7. The atomic number effect correction factor versus concentration.

E. CALCULATION OF THE R FACTORS

The R factors can be computed for pure elements by using

analytical expressions for ^ and dE/dps, provided that the energy

distribution of electrons backscattered from these pure targets is known.

i

(E)

<E) dE

RIA).-^-^^ \ ^11^ (26)

dE/dpS

with

^ (E) = Jr. dE

*^E
28 ELECTRON PROBE

where the tjCE) and dE/dpS apply to the complex or the pure target.

The analytical expressions for drj/dE or t7(E) are not available. Ii The integrations have to be carried out using either experimental \ data for T7(e) or calculated data (e.g., by Monte Carlo method or by |l transport equation method). [t An alternative way would be to start from the 0(pz) functions i determined either experimentally or theoretically. |i

where K is a normalizing factor introduced to express the numerator s and denominator in the same units. ' Direct measurements of the R factor are also possible as shown

by Derian [13], who has designed a special type of target such that f all the electrons lose all their energy inside the target material. The |1 R factor is readily calculated by comparison with a normal plane S target. ij Derian applied this method to the determination of R in pure \\ targets of Al, Cu, and Ag for a series of over-voltage ratios f Uo = Eo/Eft. As these values are in good agreement with Duncumb's \] evaluations (based on equation (27) and 17(E) derived from Bishop 'f. experimental and theoretical results) one may be confident in the fi latter. Other calculations of the R factor (by Green, from older

j experimental data, by Brown from its T.E.P. calculation) seem to i give figures which are too low.

f We are finally faced with the calculation of R^, i.e., the R factor

j for A element in a complex target. This seems a priori to be a | formidable task, as this factor like the S factor, must be dependent ' on Uo, on all the Z,, C,, and E.v, or equivalently on Uo, all the Z,, Cj,

Let us look again at the calculation of the S factor. The case of A [ radiation in pure A is very simple (E.v is aZ^ function). S(A) depends f only on Uo and Z.4. But the case of A radiation emitted from an | otherwise pure B target is more complicated. Three variables have : to be considered: U^= Eo/E.v, E^, Zb- In other words, the S factor f depends on W and Uo = Eo/E^ but W depends on Z.4 and Zb. ? For a complex target, we have to calculate a mean W depending ' on the Z, of the components, but a simple relation like = 2 C, S, [ does not hold, and is even meaningless. f

R

(27)

and Eo(=E^Uo).

I
I PHILIBERT AND TIXIER 29

i The situation does not appear to be better for the factor. In a

pure B target, R must evidently depend on Uo = Eo/E^, Ta and Zb.

According to Bishop (1966) [5], a valid approximation assumes

that R^ depends only on Uft^ Eo/E^and Z^, i.e., the excitation ratio for the analyzed element and the atomic number of the target,

j regardless the Z of the analyzed element, or more exactly,

I regardless of its excitation energy. The quantity to be considered is U^, which in fact combines two parameters: primary energy Eo,

atomic number Za of the analyzed element (or E.v equivalently).

Once this assumption is allowed, calculation for a composite target

is possible, as follows:

R^=SC,R, (28)

i where R, is calculated for the excitation ratio Uf= Eo/E.v in the pure

i targets.

' The simplification has been shown to be a fairly good one by

Bishop, who compared the resuhs of such calculations with more

direct ones carried out with the help of a Monte Carlo computation.

But, there is, a priori, no reason for such a comparison to be more

valid for the R's than for the S's.

' It would be interesting to look at the possibility of W being a more

reliable parameter, because W is determined by the properties of the

target material and of the excited A atoms. We should then need

tables of R^ versus W and = Eo/Ea-. This suggestion seems

reasonable, since W depends essentially on the target properties,

i.e., in the case of a pure B target (A emission in otherwise pure B)

Z«, Jb, and E^ (i.e., Za), all quantities on which the backscattered

electron energy and number might be dependent.

I F. THIN FILMS AND EXTRACTION REPLICAS

If we want the relative concentrations of two elements, A and B,

in a thin target, i.e., a target whose thickness is very much less than

the range in terms of beam energy (for instance an extraction replica or a thin foil for electron microscopy), the atomic number effect takes a different form.

j For such an analysis, we use a probe with constant intensity and

j energy on the same point of the target to measure the apparent

concentration = (J^/J(A)) of A and that of B, and we generally

write the result as the ratio K^/Kb. The standards are supposed to be

the massive pure elements as usual.

If we assume that the effect of backscattering in the specimen can

be neglected in this case (since we are calculating a ratio) and that
30 ELECTRON PROBE

the effects of fluorescence and absorption can be neglected in the

specimen and corrected in the standard, we have with the same

symbols as above:

N X

in the specimen dn^ = Ca — (E) dps

A

A N / (E) , m the massive standard, Ox = — / dE

A J dE/dps

Eo

and with the analytical expressions for ^ and dE/dps:

N 77- e" dnx = Ca — ^ A

• 2x bx log dps

A li'oEx

nx = — - /

N Zx bx / logU dU

A 2N J, M^logU-W^

with

E„ Za X 1-166 Ex

= -^^ , Ma = —, E$ Ja

R.4 is the backscattering factor of standard A for the over-voltage

ratio U;^, and.

i2iiL_. du

MA-logUW^

We can write as a first approximation:
PHILIBERT AND TIXIER

If we put

_

log

K Ra/s'a

If > Pb, the measured concentration in A against that of B is greater than the real concentration.

Example:

a. Analysis of very thin precipitates of Ni+Al in a carbon replica

(P^?/Pivi) =0.63 at 30 keV, 0.55 at 20 keV.

b. Analysis of low copper concentrations in a thin foil of an

aluminium-copper alloy {PaiIPcu) = 0.67 at 30 keV.

In both cases the measured value of the aluminium concentration was less than the true value. The effect is just the opposite of what

would be observed in a bulk target, and it is far greater.

If the specimen is not thin enough, or if the voltage is not

sufficiently high, the effect must lie between those characteristic of a

bulk target and of a thin foil; however, it seems difficult to calculate

the correction or even to determine whether the factor is greater or

less than one, and the absorption effect in the specimen is no more

negligible.

Experimental Results:

Ni and Al containing precipitates were extracted from a semimartensitic stainless steel. Experimental results are given in the

following table:

Ni/A, (exp^) N,/A, (corrected)

30 kV 3.27 2.1

20 kV 4.25 2.35

Without corrections, experimental results would indicate Ni2Al

composition. After correction for atomic number effect, the results are in favor of Ni Al. This determination has been confirmed by

electron diffraction (NiaAl was a possible precipitate).

31

(29)
32 ELECTRON PROBE i

I

This thin film correction has also been studied by Duncumb from

^ both theoretical and experimental viewpoints. i

III. Conclusion I As it has been tentatively shown, the expressions used for the I correction calculations depend on a lot of drastic assumptions and

!

on the validity of some physical laws involved (ionization cross-

!

sections, continuous retardation law). The validity of the|

expressions used for these laws is known to be not very good, and I probably limited to some more or less wide range of atomic { numbers. Moreover, the validity of Bethe retardation law is|

generally questionable since it neglects energy straggling. This lastf effect probably modifies appreciably the energy loss distribution as Ij a function of depth and, consequently, the ionization distribution!

with depth (the so-called 4>{pz) function). f, These limitations affect to the same extent the other approaches

which would seem more accurate: Monte Carlo computation,

|j resolution of Boltzmann transport equation. These approaches!,

suffer basically from the same inaccuracies; moreover, they giveji

numerical solutions and no analytical expressions for the Z and A

corrections. One has perhaps to get rid of the feeling that analytical

expressions are necessary and to convince oneself of the

convenience of working with tables, the results of numerical!,

methods being collected in these tables. Probably these numerical

methods will give more and more accurate results through morerealistic models of the electron behavior in massive targets. Fori

everyday calculations, however, analyfical expressions which would

need only a limited quantity of input data seem to be desirable. It iS| hoped that such better expressions will be available in the future; in! combination with tables they will permit corrections to be readily!

carried out in most of the common cases. In conclusion, the need for more reliable data concerning the

basic parameters {filp, J, . . .) as well as for the physical law! involved (^, dE/dps, multiple scattering, backscattering), must be'j stressed. j Experiments on composite targets (measurement of backscattered

electron energy distribution, direct measurement of R factor, etc.j

will enable a better check of the suggested computation of the Z

effect to be made. The case of non-metallic specimens, such as complex oxides, would perhaps deserve specially careful
i PHILIBERT AND TIXIER 33

measurements. Finally, theoretical computations, based on the

Monte Carlo model, the resolution of Boltzmann transport equation,

the invariant imbedding method (Dashen [12]) or the older

"collective" model, could perhaps be carried out with more refined

basic laws. The case of thin films and extractions replica also

requires careful attention.

rV. References

[1] Archard, G. D., Mulvey, T., X-Ray Optics and X-Ray Microanalysis,

Academic Press, New Yoric, Stanford pp. 393-410(1962).

[2] BeardenJ. A.,US AECNYO 10586,(1964).

[3] Bethe, H. A., Ann. Phys. Lpz. 5. pp. 325-400 (1930).

[4] Bethe, H. A., Rose, M. E., Smith, L. P., Proc. Am. Phil. Soc. 78, pp. 573-585

(1938).

[5] Bishop, H. E., Proc. Phys. Soc. 18, pp. 855-866 (1965), and Thesis, Cambridge

(1966).

[6] Blochin, M. A., V.E.B. VerlagTechnik Berlin, pp. 422-426 (1 957).

[7] Brown, D. B., Thesis, MIT (1965); see also: Ogilvie, R. E., Brown, D. B., Optique des Rayons X et Microanalyse, Hermann, Paris p. 139 (1967).

[8] Castaing, R., Advances in Electronics and Electron Physics 13, pp. 317-386

(1960).

Cossiett, V. E., Brit. J. Appl. Phys. 15, pp. 107-109(1964).

Cosslett, V. E., Optique des Rayons X et Microanalyse, Orsay 1965,

Hermann, Paris pp. 85-96 (1967).

Cosslett, V. E., Thomas. R. N., Brit. J. Appl. Phys. IS, pp. 883-907, 1283-

1300; 16, pp. 779-796(1964).

Dashen, R. F.,Phys. Rev. 134, A1025-A1032 (1964). Derian,J. C, Rapport CEA R3052 (1966). Duncumb, P., Private Communication; see also the paper by Duncumb

and Reed in this book. Green, M., Thesis, University of Cambridge (1962). Nelms, A. T., NBS, 577 (1956), Supplement (1958). Reed, S.J. B., Brit J. Appl. Phys. 16, pp. 913-926(1965).

Thomas, P. M., AERE, R4593 (1964). Walske, M. C, Phys. Rev. 88, pp. 1283-1289 (1952) and Phys. Rev. 101. pp. 940-944(1956).

[20] Worthington, C. R. , Tomlin, S. G. , Proc. Phys. Soc. 59, pp. 40 1 -4 1 2 ( 1 956).

THE THEORY OF QUANTITATIVE ELECTRON

PROBE MICROANALYSIS

I. B. BOROVSKII AND V, I. RYDNIK

Institute of Metallurgy, USSR Academy ofSciences, Moscow

Abstract

The authors propose a theoretical basis for a method to correct

the results of electron probe microanalysis using an external

elemental standard. The paper is divided into two parts, the first of

which provides a general expression for the intensity of

characteristic x-radiation produced by the impact of electrons upon

a thick anode. The following approximations were made in the

quantitative calculation:

1. In order to calculate the effective range of ionization by

electrons, in a given layer of anode material, the electron current

through this layer is divided into two parts: the forward current

(integrating over the scattering angles 0^(^77^77/2) and the reverse

current (integrating over the scattering angles tt/Z^^o^tt). Each of

these currents is characterized by its energy distribution and by a mean cosine of angular distribution.

2. The energy distribution of the electrons in the anode is expressed in the form proposed by Makhov, and the values of the

parameters n and p found experimentally by Dupouy et al.

3. The differential effective ionization cross-section of the given

atomic level is taken in the form proposed by Cosslett and Green.

The expression for the ionization function by electron impact

obtained under these assumptions can be evaluated by numerical

integration, and it agrees satisfactorily with the experimental results

of Castaing and Descamps.

However, the expression obtained for the x-ray intensity cannot

be presented in an analytic form in the general case. Therefore, the

authors propose in the second part of the paper an approximation for

the ionization function which allows a reduction of the numerical

calculation. In this approximation, the two variable parameters, n

and p, are considered to be constant for a mean value chosen for one

of them (n). The applicability of this approximation is tested by

comparing with experimental results the variation of the intensity of

characteristic x-ray emission as a function of the overvoltage with

35
36 ELECTRON PROBE

respect to minimum excitation potential. A similar comparison was made between calculation and measurement of the x-ray absorption

as a function of the x-ray emergence angle with respect to the target surface. Finally, we have derived expressions for the atomic numberr

and absorption corrections. A slight modification of th^

fluorescence correction procedure of Castaing is also proposed.

Results of comparing measured and calculated concentrations for a

series of binary systems of elements are presented.

In local x-ray spectral analysis with the aid of fine electron beams,

the method of internal standards is not applicable, and the use of many-element standards in the method of external standards is' complicated by the difficulty in preparing highly homogeneousj''

specimens. Therefore, in microprobe analysis one chiefly uses a' method of external standards, in which the standards are prepared

from pure elements. ^

It was shown by Castaing (1951) [1] that in the first|^

approximation the weight concentration C, of the i"' element in thJ

specimen being analyzed is found from the relation 1^

C,- = I;*/1,- (1)1 where I,* and 1, are the intensities of the measured characteristic x-' rays emerging from the specimen and the standard respectively. In the second approximation, where the differences of excitation and,

absorption of this radiation in the specimen and the standard are!, taken into account, an additional factor is introduced in eq. (1), which is called a correction to the results of the analysis.

'

Several empirical and semiempirical methods have been proposed^

to determine this correction (e.g., the review of Philibert (1965)'

[2]). The (semiempirical) nature of these methods of calculation is, basically due to the complexity of the theoretical description of the'^ distribution of electron scattering and deceleration in solids.P Experiments indicate that the accuracy of currently used methods off calculation is not always satisfactory; therefore, further procedures?' are required.

The intensity of characteristic x-radiation emerging from thef, specimen is, in general, the sum of three terms corresponding to theSj excitation by electron collision (e), the fluorescence excited hyf

characteristic radiation of other atoms (f)^ and by the!' bremsstrahlung emitted by the electrons (b), at frequencies abovej

the absorption edge of the corresponding q, level: !

I,-* = I,>*(1 +I,//I;e* +I;o*/I,-/) (2)j

I

I,

-

i'

I

I
I BOROVSKII AND RYDNIK 37

When the fluorescent radiation excited by other elements is weak,

the second term in (2) can be neglected (this term will be considered

at the end of this paper); experiments also show that the third term

in (2) is significant only for elements with high atomic number. In

this work it is assumed that this term is negligibly small. The expression for !,> has the following form for massive

J specimens:

(3)

where No is the electron beam intensity impinging upon the sample,

N, is the number of atoms of the i'" element per unit volume of the

specimen, W, is the fluorescent yield in the q, level, /x, is the (linear)

absorption coefficient of the respective radiation in the specimen, 6

is the x-ray emergence angle, and >//ie(x) is the distribution of the

radiation excited by the electrons of the q, level at the depth x of the

specimen.

In this paper we describe a method for calculating based upon

the use of the law of attenuation of parallel monoenergetic electron

beams in matter which was introduced in the publications of

Makhov(1960) [3] and Dupouy and co-workers (1965) [4].

One can write i//,e in the following general form:

i//,> = S (F,(x,E,(^)/cos0)o-(E,E,)dEdfl (4)

in which Fi(x,E,i//) is the distribution of electrons according to energies (E) and angle ((/>) with respect to the initial direction at the

depth x in the specimen; C7(E,E,) is the differential effective crosssection of excitation of the q, level of characteristic radiation; cos <^ takes into account the effective path of electrons in the layer of

material between the depths x and x+dx, which, due to scattering, is longer than the thickness of this layer; Eo is the initial energy of the

electrons, E; is the excitation energy of the q; level, and s is a

universal factor of proportionality.

The current theory of the scattering of electrons with energies of

the order of 10^—10^ electron volts does not allow the satisfactory

calculation of the function F,(x,E,(/)) for all angles of scattering in the range 0^(/)^7r, and for energies of the electrons such that E/^E^E„.

Therefore, in most publications (e.g. Castaing (1951) [1]) the

following simplification is made:

(F,(x,E,<^)/cos(/))-^F(E) (5)
38 ELECTRON PROBE

That is, the angular and energy distributions of the electrons are

'

neglected; the function F(E) is considered to be universal and thef difference in the conditions of electron deceleration in different f elements is introduced as follows. One introduces (5) and (4) into (3)1. and disregards the absorption (/u,, - 0); thus,-one finds f

where x, is by definition the depth where E(x,) = E,. In this way, the

differences which were pointed out above are transferred to the

stopping power of the (target) material, -(dE/dx),. Moreover, in this

^ form the electrons which are backscattered do not appear in the! calculation, and their contribution toi//,emust be taken into account

through an empirical factor A.; in (6) (Castaing (1960) [5], Poole and'

Thomas (1961) [6]). Philibert (1962) [7] attempted to empirically

account for the backscattering of electrons and to obtdin a form of

i|/,> closer to the experimental values (Castaing and Descamps

Both these methods have the disadvantage of neglecting the energy distribution of the electrons. In particular, the existence of

this distribution leads to the fact that »//,>(x > x/)7^0. In addition, thei quantity E in (6) is actually used in the sense of a mean energy of

electrons; and while there is a theoretical expression (Bethe and co- workers (1930) [9]) for dE/dx, this, however, is valid only for the

path length of electrons, so that x does not coincide with the

thickness of the material along the original direction of the electron | beam. Therefore, (6) is only a quite coarse approximation, even, when the backscattered electrons are empirically taken into account. On the other hand, the method of Philibert ignores the factj, that at the depth of (complete) diffusion, the angular distribution of

electrons becomes isotropic, and therefore cos (/> in (4) cannot be

considered to change continuously at all depths of x, as Philibert assumes. jl; Rejecting all the assumptions which are not well founded, we|j

introduce the following simplification. We divide the electron beami

which passes through a section of the specimen into two parts: those

moving in forward direction (0^(^T,^7r/2) and those moving in'i backward direction (7r/2^<^s^77'), each being characterized by its energy distribution and mean angular distribution:

(6)

(1955) [8]).

F (x,E,0) cos <j)

gr? (x,E) +

g5 (x,E)

(7) cos (]) (x) cos 4>Q (x)
BOROVSKII AND RYDNIK 39

where the indices 17 and 8 correspond to the forward and backward

fluxes. In what follows, in the calculation of we will use for

cos(/)i7(x) the expression obtained by Blanchard and Fano (1951)

[lOJ, and for the cross-section cr(E,Ei) the expression proposed by

Green and Cosslett (1961) [1 1 J. Then, the calculation according to the scheme which we propose for the backscattering (mainly

Rutherford scattering) shows that cos 08(x) — const. = 1/2. Let us now turn to the determination of gr, and gg. To obtain gr, we

will use the law of electron attenuation of Makhov and Dupouy

i7(x) = (N(x)/No) = exp { - (x/X)p} (8)

where

«E„" /Zy/^ 1.51 n X = ' n = 2.44 (1 , p =

(9)

p. A, and Z are the density, atomic weight, and atomic number of the

material, and a = 3.33 x 10"^, when Eo is expressed in kV, and x in cm.We note that the equation (8) can be obtained starting from the

consideration that the linear attenuation coefficient of electrons in substances, q(x), is determined by the electron scattering processes

which depend on the energy E(x). Writing the equation for the

electron flux

N(x) = No- N(x)q(x)dx, (10) o where x = x/X, and assuming for the sake of simplicity that q(x) =

ax* where a and b are constants greater than zero, we find from (10)

for the boundary condition N(0) = N^:

7}(x) = exp j- (10a)

whence assuming that a = b+ 1 = p we come to (8). The value of p is thus larger than 1 for all elements, and this agrees with experiment

(Dupouy etal. (1965) [4]).

To find g7). one must also know the law of electron deceleration. Let us consider a group of electrons of energy Ea . among the

electrons which traverse the thickness x of the material. Let us call the maximum range of this group of electrons Xfc>x.To determine the

relation between E/, and xa we will use a power law of deceleration

of the form proposed by Dekker (1 958) [ 1 2]

E"(x) = - cx,c = E„"/x„,, (11)
40 ELECTRON PROBE

When this law is applied to the group of electrons with energy Ea , we

obtain

E

^ — . = 1 - — = 1 - — • (12)

E„" X;, X;,

Then, according to the definition of xa

r?(XA)=r/(x)- gv{xS<i^- (13)

'o We find therefore that

Using (8) and (12), and eliminating the index k due to its arbitrari-

'

ness, for {O^^k^ 1 ), we find

grj{x,0 = mx" i exp )- / ^ V}

gr,(xSd^=rfx^ (15)

I'

To determine gs, let us consider the following calculations. A

layer of material at depth from x to x'^dx attenuates the electron

flux by dN(x). Calculations show that the probability of double

backscattering at such depths, for E—IO''- 10^ is negligibly small,

compared to the single backscattering in the layer between 0 and x- Because of this the backscattered fraction from the layer at depths

X, X"'"dx moving towards the surface of the specimen (x = 0) is mainly absorbed. Let dNsCx) designate that fraction of the electrons

which emerges through the surface of the specimen, and let a thickness sx of the specimen (s > 1) be such that the attenuation of

the beam N(x) will there be the same (in relative units) as the

attenuation of the (upward) beam of dN(x). Then we may write

(dN8(x)/dN(x)) = (N(sx)/N(x)). (16)

Using for N(x) the expression (8) and assuming for simplicity that s

is constant or that it is a slowly varying funcfion of x, and also taking

into account that the backscattering coefficient Soo (for a thick

I
BOROVSKII AND RYDNIK 41

: specimen) tends to 0.5 with increasing Z(p-^l), we find that s = 2,

and that 8JZ)=0.5P<2) (J 7)

' A comparison of from equation (17) with the results of the

calculations of Everhart (1960) [13] and Archard (1960) [14], and

j with experimental determinations (Philibert (1962, 1964) [15]) is

j given in Figure 1. It is seen there that equation (17) gives a

I I satisfactory agreement with the experiment for all values of Z.

20 40 60 80

Z

Figure 1. Dependence of the coefficient of backscattering of electrons, on the

1 atomic number z. : equation (17); : Archard (1961) [14]; :

1 Everhart (1960) [13].

1 Figure 2 shows the fraction of electrons A/j = 1 — rj/j — 8/; which is

> absorbed in the film of thickness D, according to equations (8) and

! (16), and the corresponding experimental results obtained by

Cosslett and Thomas (1964) [16]. These calculations allow us to

j conclude that the main contribution for the backscattering is due to

I the processes of elastic single scattering (Rutherford scattering) of

' electrons at angles (/> > 7r/2. Hence, using the expression which was

S found with the aid of the equafion (16) (when s = 2) for the total

295-798 0-68—
42 ELECTRON PROBE

0.75 r

0.50 -

0.25 -

yoO, 10"' r/cm

Figure 2. Fraction of electronsA,; = I -t,„-6„. which is absorbed in a copper film of thickness D, for E„ = 5, 10, 15 i<eV. : theory, : experiment (Thomas and Cosslett ( 1 964) [16]). number of backscattered electrons which pass through the section x

of the specimen, we write

S{y)=l I ld,7(y)=p/ yP-i exp |-(2y-x)P}dy (18)

Using the energy distribution gr, ( 1 5), we find the energy distribution

of the backscattered electrons, gs(x,^)

g8 (x, ^ = / —- g (2y-^,^) d7;(y) =

d77(y)

= 2 P"

\l_^n)p.iy^

y-'(2y-x)^ exp |-[U d-a-] (2y-^)P} dy.

(19)
BOROVSKII AND RYDNIK 43

In particular, for backscattered electrons which emerge from the

surface of the specimen, we have

pn A^id-^f^i /*!

gS(0,a = , / g3(0,ad^=5.o . (20)

A comparison of (20) with the experimental results for the

determination of gg (Brandt (1951) [17]) is given in Figure 3. We

see that the agreement is quite satisfactory.

0.2 0.4 0.6 0.8

e

Figure 3. Energy distribution of backscattered electrons, g(0,f) for various

elements. : equation (20), : experiment (Brand (195 1 ) [17]). We have calculated gn (15) and ge (19) for p = 2 and inserted the

results into (7) and then into (4). The choice p = 2 is conditioned by

the possibility of analytical calculation of the integral in ( 1 9) and also

by the fact that this value of p corresponds to Z«20; in this region of

Z we have experimental results available (Castaing and Descamps

(1955) [8]) which allow us to carry out a comparison. This

comparison is shown in Figure 4, where the upper curve (for Cu)

corresponds to p = 1.7, and the lower curve (for Al) corresponds to
44 ELECTRON PROBE

0.5 1.0 1.5 yox ,mg/cm2

Figure 4. Distribution of the intensity of characteristic x-rays in a massive anode. ; 1,3: experiment (Castaing and Descamps (1955) [8]) for Cu and Al; 2: theory, ! with p= 2.

p = 2.3. Figure 4 indicates a quite satisfactory agreement of the

proposed calculation of i//,e(x) with the experimental results.

j However, for non-integer values of p (equation 9) these I calculations require the numerical integration of (4) and another

numerical integration for the determination of !,> from (3). Therefore, there arises a need for an accurate and simple

| approximation to (//,>, which would allow us to carry out the , calculation of !,> in an analytical form. The examination of

experimental results for allows us to conclude that their dependence on x is quite similar over a wide range of Z, and i therefore of p, even including the case when p tends to 1 . Moreover,

ijjie appears only under the integral sign; and this permits us to introduce a simple function which compensates for the hump of
BOROVSKII AND RYDNIK 45

at small values of x and for the rapid (~exp(- x^)) decrease of t//,> at

j large values of xI Starting from these considerations, we will choose a tentative

j approximation for in the following form:

I l//ie~l//ie(0)exp ) ^ ( (J])

! . / ^^'^

j where ^, = E,7Eo and x and n are calculated from (8) and (9). The

definition of ^ie(0) according to (4), (7), (15), and (20) yields the

following:

ln/3 /"l

|8 Jl/13

= ^{l + 2Soo(l-^-")''| (22)

where ^ = 1/^,. A comparison of the results of calculating i//;e(0) according to (22) with the experiment is given in Table I.

I TABLE 1

! Matrix Emitting ^

^a(I) 0(0) ,,,/ax(2; element A element B (eq.9) (eq.9) " (eq.22)

Au Bi 1.55

Cu Zn 1.65

Al Cu 1.70

1.22 2.18 0.44 1.57 1.61 1.70 3.01 .30 1.46 1.475

2.30 3.21 .135 1.19 1.16

iPhilibert(1962, 1964) [15]. ^Castaing and Descamps (1955) [8].

Substituting (21) and (22) into (3), we can obtain the dependence

of the intensity of the characteristic radiation of a pure element !,> on

the overvoltage (3 = Eo/E,, the (mass) absorption coefficient r, =

fMilpi, and the emergency angle of this radiation with respect to the

specimen surface:

I(iS,r,e)~[l + 2Soo(l-/S-")n 77 • (23) ^ l + Q(iS"-l) j8
46 ELECTRON PROBE

In this equation, Q = aE,"T, cosec 6. When I3»\ , the relation (23) is reduced to the following form:

I(^)~(Zn^.^"- ')/(! + Q 13") (24)

and it is characterized by a maximum at /3„,, which is determined by

the equation

In 8_. 1 - >0 (24a)

1 + Q^"

The dependence of I(t,0) for /3 = const, has the following form:

l{T,d) 1 (25)

1 + Q(iS" - 1) We checked the expressions (24) and (25) over a wide range of f3 and Z. The comparison of (24) with the experiment (Campbell

(1963) [18]) for Be, B, and C (in these cases p > 3) is shown in Figure5,and the comparison of (25) with the determination of 1(t,0)

20

I()S)

10 /

-

B r .10

1 1 20 30 Eq,

1 1 1 20 40

1 1 1 1 60 80 100 p. Ill

20 40 60 80

1 1 100 120 140 /S1 1 1 " 50 100 150 200 250 B

Be

Figure 5. Dependence of for K radiation of light elements. Solid curves

represent equation (24); points represent the experiment of Campbell (1963) [18]. ,
BOROVSKII AND RYDNIK 47

for alumi num, for different values of f3 (Green (1964) [19]) in Figure 6. In all these cases a quite satisfactory agreement of

theory and experiment is observed.

3keV

-0.2 -

-0.4 -

logf (/I)

-0.6 -

-0.8 -

4 6

cosec 6

8 XIO

ngure 6. The dependence of 1(ij.,9) for Al Ka radiation, for various values of E„ : equation (25), points represent the experiment (Green (1963) [19]).

Equation (23) can be used to introduce corrections which take

into account the atomic number effect and the absorption (of x-rays)

in the calculation of the results of microprobe analyses using pure

elements as external standards. In this case, we have

k, = I,*/I,=c,R,<'>Ri<2),

where

R(2)

1 + 2Si(l-|Q-")

1 + 25oo(l-/3-")

1 + a r.-i (1-/S~" ) cosec

where 8l

1+a E^r-i (1-^-") cosec d

2:c;Sooi (Castaing(1960) [5]), =1cjtij ,

(26)

I
48 ELECTRON PROBE

Tij being the absorption coefficient for absorption of qrradiation of

element i by element j. In accordance with the approximation (21) we chose for n a value equal to 1.62 (Dupouy et al. (1965) [4]).

For elements of relatively close atomic number Z, the factor R,**) = 1, within limits of experimental error. Thus, (in absence of

fluorescent excitation) (26) reduces to a linear system of equations:

C; (1 + q; Tii)

k,- = (27)1

j

in which q, = a(E„" -Ei")cosec 6. This system can be solved without

j difficulties. In particular, for binary systems of elements, we have

| ki (1 + q,-r,;) 1) C, = (28) L q,.[k,r,.^. + (l-k,.)r;,.)

\

i We shall give here the results of comparing equation (26) with|

experiment, including limiting cases in which either R,"' or R/^' are,|- for all practical purposes, equal to one. A comparison of the data]

given by Poole and Thomas (1961) [6], and Ziebold and Ogilvie,

( 1 963) [22] with our own results is given in Table 2. f A comparison of results of the determination of C/ e in the system

Fe-Cr, according to equation (28), with the data of Colby andj

Conley (1965) [20] is shown inFigure?, where we also present the' results of the calculation according to Duncumb and Shields (1965)|

[21], and to Ziebold and Ogilvie (1963) [22]. It is seen that the'; precision of equation (28) is compatible to that of the method of

Duncumb and Shields when C/ is small, and somewhat better when

C/.e is large. The fact that these relations show the same type of{

divergence from the experimental values when different]

assumptions are being used indicates that there is probably some

systematic error in the measurements of k/. e by Colby and Conley. ,

:

In the case of many-element specimens in which there ii considerable (fluorescent) excitation of the radiation of the level q/

by the characteristic radiation of other elements with Vj>Eilh, the second term in (2) must be taken into account. We use an expres-,- sion obtained by Castaing (1951) [1] which is the most accurate of

all those proposed (see Duncumb and Shields (1963) [23]); but wewill slightly change several terms. Instead of the energy factor Ei/Ej we shall use the excitation cross-section in the form proposed
I BOROVSKII AND RYDNIK

by Green and Cosslett ( 1 96 1 ) [ 1 1 ] ; thus we obtain

E, In (E„/Ep

E. In (E„/Ep

49

i TABLE 2

Element

System being c^ chem. k C AC/C%

analyzed (eq. 26)

>Ib/Be Nb 0.462 0.454 0.460 -0.4

no Ti .750 .722 .745 - .7 |\u/Mn Au .765 .683 .735 -4.0

u .881 .837 895 +1.6

^rSii. Zr .620 .544 578 -6.8

;^U/AU Au .238 .174 735 -1.2

pu/Al Cu .536 .496 .539 + .6 IvIO Zr .945 .920 .935 -1.1

\u/Ga Au .739 .718 725 -1.9

Fe .700 .653 704 - .6 f^i/Pt Ni .551 .560 .555 + .73

1 .297 .305 .296 - .34

.164 .166 .162 -1.22

.065 .067 .066 +1.5

\u/Cu Au .206 .152 .198 -3.88

.402 .324 403 + .25 .601 .505 .602 + .16

.799 .730 .799 0

ra/Ru Ta .165 .160 .175 +6.1

.309 .289 .311 + .65 .434 .414 .439 +1.14

.544 .532 .558 +2.57

.642 .635 .662 +3.12

.807 .800 .812 + .62 .941 .960 .963 +2.34

This, in accordance with the experiment, sUghtly decreases the

correction for fluorescence. The improvement obtained by inserting

a-' = [a(E„" —£/')]-> instead of the constant of Lenard (cr) in the log term v = cripr*, which follows from the law of attenuation in equation (8), is less important. Finally, the possible difference

between the q; level of the spectral series which causes the
50 ELECTRON PROBE

2.3

2.2

2.1

^Fe'°^° 2.0

1.9

1.8

15 25 \N15 45keV

4.2

4.0

c o/ 3.8

3,6

3.4

15 25 35 45keV

CFe°/o

10.5

1.0 9.5

9.0

8.5

15

—

25 35 —X

45keV

^x\

Figure 7. Concentration Cfv in the Fe-Cr system as calculated from the values of

j kf f measured by Colby and Conley (1965) [20]. o: equation (26), x: Duncumb and , Shields (1 965) [2 1 ] . A: Ziebold and Ogilvie ( 1 963) [22]

.

excitation and the q, level which is excited can be taken into account

following the procedure of Reed (1965) [24]. Figure 8 shows the[' improvement of the correction for fluorescence in C( r in the system'

Fe-Cr which is obtained when these modifications are introduced,

using the data of Colby and Conley (1965) [20] of kcr- For

comparison, we also give there the results of calculations by the

unmodified equation of Castaing and by the equation of Ziebold and:' Ogilvie (1963) [22] and Wittry ( 1 96 1 ) [25]. ; In general, the equations (2) constitute a substantially non-linear!

system which can be solved only by successive approximations.!

Due to the large volume, such calculations can be carried out only on an electronic computer.
BOROVSKII AND RYDNIK 51

Ccr.%

0.90

0.80

0,70

^

J

35 ^« keV

-X52

50

25 35 keV

48 -

91

Ccr . %

90

89 -

. 20 _ 30 4(0 keV

.—-oigure 8. Concentrations C, > in the system Fe-Cr, calculated from the values of krr measured by Colby and Conley (1965) [20]. o: theory, •: Castaing (1951) [1]. with improvement according to (29), x: Castaing (1951) [I]. A: Ziebold and

Ogilvie(1963) [22]. : Wittry (1961) [25].

REFERENCES

] Castaing, R., Thesis, Paris (1951).

[2] Philibert,J., Publ. IRSID.Ser. B,No. 51 (1965).

3] Makhov, A.,Fiz. Tverd.Tela2,2l61 (1960).

4] Dupouy,G.,etal.,Compt. Rend. 260,6055 (1965).

;5] Castaing, R., Adv. Electron. Phys. 13, 317 (1960).

'6] Poole, D. , Thomas, A., Rep. AERE R-38 1 5 ( 1 96 1 ). 7] Philibert, J., X-ray Optics and X-ray Microanalysis p. 361 (1963).

8] Castaing, R.,Descamps, J., J. Phys. Rad. 16,304(1955).

9] Bethe, H., Ann. der Physik 5, 325 (1 930).
52 ELECTRON PROBE

[10] Blanchard,C..Fano, U., Phys. Rev. 82,767 (1951). [11] Green, M.Xosslett, v., Proc. Phys. Soc. 78, 1206(1961).

j [12] Dekker, A.. Solid State Physics6, 251 (1958). ! [13] Everhart.T.J. Appl. Phys. 31, 1483 (1960).

j [14] Archard, G.J. of Appl. Phys.32, 1505 (1961). | [15] Philibert,J.,Weinryb,E.,C. R. 255, 1757 (1962), C. R. 258,4535 (1964).

j [16] Cosslett. v., Thomas, R., Brit. J. Appl. Phys. 15,883 (1964).

'

[17] Brand, A., Proc. 12th Ann. Conf. Phys. Electronics, p. 74 (1952). I [18] Campbell, A., Proc. Roy. Soc. A274, 3 19 (1963). [19] Green, M., Proc. Phys. Soc. 83,435 (1964). [20] Colby,J.,Conley,D.,NLCO Rep. No. 960(1965).

[21] Duncumb, P., Shields, P., Tube Invest. Res. Lab. Rep. No. 181 (1965). [22] Ziebold,T.,Ogilvie,R.,Anal.Chem. 35,621 (1963). [23] Duncumb, P., Shields, P., X-ray Optics and X-ray Microanalysis, New Yorl Acad. Press, p. 329(1963).

[24] Reed,S., Brit. J. Appl. Phys. 16,913 (1965). [25] Wittry , D. , J. Appl. Phys. 29, 1543(1 958).
ON THE STRUCTURE OF FORMULAS FOR

QUANTITATIVE ANALYSIS

JOHN CRISS

Naval Research Laboratory, Washington, D.C.

Abstract

Two mathematically equivalent forms for expressing total haracteristic x-ray emission are discussed. It is shown that the

ommon practice of representing the various physical effects as a

lequence of correction factors has led to approximations and

ssociated errors. The less common formulation, which expresses

3tal x-ray emission as a sum of several contributions, would be

qually convenient for computation, if the approximations were not

lade. A new formula is proposed, to express fluorescence by

haracteristic lines in terms of f(x)- As an example, Philibert's f(x)

|/as used to compare this formula with the mathematical form

btained by Castaing and others. Using the same values for luorescence yield, absorption coefficients, and all other

indamental parameters, the two expressions can differ by more

lan 6% in their predictions of the fluorescence contribution.

I. Introduction

This discussion is essentially an essay, in that it represents a

ersonal point of view and makes no attempt at completeness. The

irst half includes an interpretation of the basic problem of

uantitative analysis and some general comments on approaches to

fie problem of developing convenient formulas. The second half

ompares an equation written in terms of correction factors with one

rtat expresses total x-ray intensity as a sum of primary and

econdary contributions. A new formula is proposed, to express

Juorescence by characteristic lines in terms of f(x). This formulation

voids the previous necessity of approximating 0(pz) and provides

convenient means of improving the fluorescence correction as

etter expressions for f(x) become available.

53
54 ELECTRON PROBE

II. Discussion

A. PROBLEM

The fundamental premise of quantitative electron probe analysi

is that, given a set of operating conditions and a measure(

characteristic x-ray emission spectrum, there can be only om

composition for the specimen.

The basic problem is to discover this functional relationship, an( to express it in a form that permits calculation of specime

composition. Ideally, one would have an explicit equation—

j Mass concentration of a particular element = some function of:

j relevant properties of all elements in specimen, measured

characteristic x-ray intensities, properties of the apparatus, \ operating conditions , and other environmental factors. !;

Failing the discovery of such an explicit expression, one v^^ould ha\^' to use an implicit formulation, from which specimen compositioi"

might be determined by a number of techniques. P The problem involves, first of all, identifying those features thaj affect the experimental results, and that also vary within the scopj

of the desired formulation. The second part of the problem involve^j

expressing our understanding of the effects of all relevant variables.^ The essential requirement is to express the effects of changes i,jj various parameters, and not necessarily to express all the physicjj

interactions through which these effects arise. In other words, the^

is nothing wrong with an empirical method that work

Unfortunately, the empirical methods suggested to date general

require the analysis of several standards and usually are of limitejj applicability.

B. APPROACHES

It is the failure of empirical approaches, together with our desi

to understand and formulate the physics involved, that requires us express the effects of different parameters in terms of o knowledge of more fundamental physical processes. A "bru^

force" approach that, in principle, would solve the problem wou[

be a complete Monte Carlo treatment. A large number of electrot would be followed through every interaction until they either h?* escaped the specimen or had lost sufficient energy to be no longer '

interest. All the consequences of these interactions wou

themselves be described, and the final effects of interest would f
CRISS 55

;alculated. The disadvantages of such a treatment include the

inormous number of calculations needed to insure statistically good

esults and, more seriously, the huge quantity of fundamental

nformation required to describe all the individual interactions,

iufficiently accurate data simply do not exist.

It is true that if we really understood all the fundamental physical

nteractions quantitatively, then we could calculate composition rem relative x-ray intensity. However, it does not follow that to

ichieve any specified finite accuracy we need to understand all the

>hysical interactions. Such complete understanding is an ultimate

|oal, but our present analysis techniques must be based on whatever

Siformation is available. The degree to which we analyze physical

|rocesses, and the kinds of interactions on which our calculations

re based, should depend upon whether the ultimate interactions are ny better understood than their grosser effects, and whether the

ombined effects of these ultimate interactions really can be

[xpressed and calculated.

i When suitable simplifying assumptions are made, then Monte

l-arlo calculations become much less formidable and numerical

'Olutions of a transport equation become feasible. In addition, fewer

liput data are required for such treatments. The accuracy of the

I jsults depends on the accuracy of the input data, the aptness of the

|iathematical model, and the precision of the computational

^chnique.

i The results of interest should be checked with experiment. If the

greement is not satisfactory, then the mathematical model might be

lodified and more accurate input data might be sought. If the

;sults of our most elaborate calculations, using the best input data

i'ailable, still do not match our observations within the

tperimental error, then we probably will try to adjust our

iilculations in a manner that would insure agreement. Thus we

i Ould make our method partly empirical.

I If we are interested primarily in the physics of x-ray production,

len an empirical adjustment would be unappealing; we would

refer to let experiment determine fundamental parameters (such as

|irious cross-sections), rather than affect our results more directly.

However, if our main concern is to calculate the composition of

ectron probe specimens, then we would welcome any method, to jhatever extent empirical, that would be widely applicable and that

,ould give good answers. Of course, we also want calculations that

re simple.
56 ELECTRON PROBE

C. DEVELOPMENT OF FORMULAS ; One very great advantage of the fundamental approaches is that! they can lead to convenient formulas. Suppose a method o^

calculation, perhaps very complicated, has been tested

experimentally for several widely different situations. This method

could be used to generate values of compositions and corresponding

x-ray intensities for a greater variety of situations than experiment

alone could feasibly provide. Such information could be used to check the results of more approximate treatments. It might alsd happen that simpler theoretical approaches could provide

mathematical frame into which could be substituted parameter;

calculated solely to make the simpler formula agree with results o

the more elaborate calculations.

As suggested earlier, the real test of a formula is whether thi results of direct interest in quantitative analysis agree will experience. To check less essential implications of a method migh|

be too severe a test. An example is provided by Philibert's

f{ \ 1 + h

fix) = (1 (1 + x/o)[l + h(l + x/a)]

This representation corresponds to an electron excitation functio! of the form

0(pz)=(const.) X {exp [- apz] -exp [- Ij-h. apz] }, (2 h

which may be verified by calculating

F(x)=j 0(pz) exp [- ^pz]dpz

and

f(x)=F(x)/F(0) 0

An interesting feature is that

0(0) = 0 (.

regardless of the value of the constant. Such obvious disagreeme

with measurements of 0(pz) (Fig. 1) should not in itself be

criticism of the formula for f(x). Philibert's equation (especially wii the cr as modified by Duncumb and Shields, and others) has enjoyi

wide applicability and reasonable accuracy. i

t
CRISS 57

3

0 .5 1.0

p-L in mg/cm2

Figure 1. Comparison of two (/)(pz) curves for copper at 29 keV. The solid line is the measurement by Castaing and Descamps. The dashed line corresponds to

Philibert's f(x) with the Duncumb-Shields cr. The curves are normalized to give

equal values for F(0).

D. STRUCTURE OF FORMULAS

Whether one used elaborate calculations or a partially empirical

technique, there would seem to be an advantage in organizing the

J available information in a way that treated individually those

I contributions that could be found separately.

295-798 O 68—
58 ELECTRON PROBE

It has been customary to consider separately the following three sources of characteristic radiation:

(1) ionization by the incident electrons,

(2) ionization by other characteristic radiation, and

(3) ionization by the Bremsstrahlung.

If these components are labeled I,, l2,and l3,then the total intensity}

is

'

I=l,+l2 +l3 (6)|

and relative intensity is

'

I h + h +h

I* I? + I| + I* (7)

where the asterisk refers to the comparison standard. In spite of the simplicity of this last equation, the relation often is''^ expressed in terms of factors:

l2\ / h

1 + — 1 +

1 + — 1 +

IT / \ I* +

1*

These two forms are mathematically equivalent, and the choic(

between them could be a matter of personal preference. The firsi factor in equation (8) usually has been written as the product of ari "atomic number factor" and an "absorption correction factor". Th(

remaining factors are "fluorescence correction factors" fo excitation by other characteristic lines and by the continuum.

Each correction factor supposedly accounts for the effect of

different type of physical interaction. The atomic number factor ii fashioned so that it would equal unity if the rate of characteristic x

ray production caused directly by electron ionization of the targe

atoms were proportional to mass concentration. The absorptioi

correction factor is so contrived that if certain combined effects o electron scattering and x-ray absorption were the same for unknowi

and standard then this factor also would be unity. Similarly, thj greater the contribution of fluorescence by characteristic lines, the the further the fluorescence correction factor departs from unitj' Fluorescence by the continuum is considered by means of anoth^

factor with similar interpretation.
CRISS 59

The arrangement of these contributions into factors has three

disadvantages. First of all, these factors do not contain only those

effects that they presume to describe. Each factor includes other

contributions. Secondly, if Ii, I2, and I3 are calculated individually,

then the factorization creates a mathematical redundancy that

increases computational labor. Thirdly, this redundancy tempts us

to make approximations in order to simplify the formula. One

approximation that suggests itself immediately is to take

This introduces very little error, for I2 and I.{ are generally small,

compared to Ii. Nevertheless, this approximation is not necessary if we use I=Ii + l2+l3.

Approximations have been made in several derivations of the

factor for fluorescence by characteristic lines.

To illustrate this, it will be necessary to express Ii and I2 in some

detail. The primary radiation for element A can be written as

where the absorption function f(x) applies to element-A radiation.

The factor G.i represents the total radiation of element A that is generated throughout the specimen, before any absorption occurs.

It has been shown [ 1 ] that the element-A radiation fluoresced by

element-B characteristic radiation can be expressed in terms of f/,(x) as follows

(9)

Ii=G^f^(X.4) (10)

dt (11)
60 ELECTRON PROBE

Simplification of the integral above will be described a little later. At the moment, consider what happens when the effect of

fluorescence is expressed as a factor:

l2\ isiXA) 1 Gb / 1 \ { ) 1 + — =1 + . C^co^ll--) Mfif'-y (12)

A natural temptation is to simplify the expression by making the

approximation

= 1 (13)

In fact, this is precisely one of the approximations made by Castaing

in his derivation [2], and made also by several others [3,4] who I have developed or modified formulas. It is not obvious whether this approximation always is a safe one to make. Using the Philibert

expression for f(x), as modified by Duncumb and Shields [5], one

finds that for a 10% Cr— 90% Ni specimen, analyzed with a probe

voltage of 20 kV and a take-off angle of 10°,

= 1.03 (14)

fcr(Xcr)

Fortunately, though, this 3% error in the fluorescence intensity I contributes only a .3% error to the total intensity, for this particular

case. Perhaps for some other specimen the errors would be greater.

At any rate, these errors can be avoided simply by not making the

approximation.

The integral that occurs in the complete formula (Eq. 1 1) can be i eliminated easily whenever f(t) is represented by a rational function

| (a quotient of two polynomials). For example, one of the !* approximations of Castaing was to use

j chipz) oc e-^P z

(^15) I

in part of his derivation [2] . From the definition of f(x) "(Eqs. 3 and

4), one may calculate

f(t) (16)

t + CT
CRISS 61

which permits integration in closed form, leading to

^ ln(l+ —\+lin(l+—) (17)

This result is the same as Castaing's, which originally was obtained

through a different mathematical formulation.

Although Castaing's formula is a good compromise between

accuracy and mathematical complexity, it would seem reasonable to seek further improvement by taking advantage of the general

formula (Eq. 11), and using whatever additional information we

have concerning f(x). At present, a useful expression is Philibert's

[6]

1+h

Ux) = — (18)

(l+x/o-«)[l+h(l+x/o-«)]

This, of course, is a rational function, and permits reduction of the

integral in equation (1 1), leading to

Xa

Xa \ l^-MB

+

^2 + Xa , , ^1 ^1 +Xa , A

In 1+ +. ln[l + —L-] (19)

b^(b2-b^) fi^ij b2(bi-b2) MB

where

, 1 + h = and b^ = — as (20)

h

The result is slightly more complicated than Castaing's formula, but

would be practically no more time-consuming in computer

calculations.

This expression was compared with Castaing's (Eq. 17) for a 10% Ti-90% Cr binary analyzed at 30 keV with a take-off angle

of 15°. The Philibert f(x), as modified by Duncumb and Shields [5] was used. If the same parameters are substituted into equations

17 and 19, the values differ by 4.1%. A more appropriate comparison is to use the Philibert a [6], as recommended by Reed [4],
62 ELECTRON PROBE

when evaluating equation 17. If the Duncumb-Shields o- is used,

as before, in equation 19, then these two expressions differ by 7%.

This produces more than 1% error in the total calculated intensity. Errors of this size might not be particularly serious. The point is that here is one more source of error that now can be avoided.

III. Conclusion

The effect of fluorescence by characteristic lines can be expressed

in terms of f(x), without any need for cf>{pz) per se. When f(x) is represented by a rational function, the resulting formula has a form ; that is convenient for calculations. In particular, Philibert's f(x) is well suited, and produces a formula only slightly more complicated

than Castaing's. As better expressions for f(x) are developed, the

formula for fluorescence by characteristic lines can be improved j correspondingly.

Il IV. References

[1] Criss, John W.. "Secondary Fluorescence in Terms of f(x)". Paper No. 9,^ Second National Conference on Electron Microprobe Analysis, Boston, f Mass., June 1967.

f [2] Castaing, R., Thesis, University of Paris, 195 1 ; translation by Duwez, P., and » Wittry.D. B.,WAL 142/59-7, California Institute of Technology, 1955.

^ [3] Wittry, D. B., Thesis, California Institute of Technology, 1957.

[4] Reed, S. J. B., British Journal of Applied Physics, Vol. 16, 1965, pp. 913-926. '

[5] Duncumb, P., and Shields, P. K.,The Electron Microprobe, McKinley,T. D.,\

Heinrich, K. F. J., and Wittry, D. B., eds., Wiley, New York, 1966, pp. 284-

295. f [6] Philibert, J., X-Ray Optics and X-Ray Microanalysis, Pattee, H. H., Cosslett.j V. E., and Engstrom, A., eds., Academic Press, New York, 1963, pp. 379-j 392.

t
COMPUTATIONAL METHODS FOR X-RAY

EMISSION FROM TARGETS EXCITED BY

ELECTRONS

D. B. BROWN

Electrical Engineering Department, University of Southern California^ Los Angeles, California 90007

Abstract

This review treats the question, what methods are at our disposal

for the theoretical calculation of the production of electron excited

x-radiation. Three approaches to the problem are described:

numerical solution of a Boltzmann equation for electron transport,

analytical solution of a Boltzmann equation in terms of moments of

the electron distribution, and Monte Carlo calculation of the travel of a representative group of electrons. The differences and relative

advantages of the three methods are stressed. Limitations of the

theory and of the necessary input parameters to the theory are commented on. Some significant predictions of the theory are compared with experimental work.

I. Introduction

The aim of this paper is a brief critical survey of the presently

available techniques for the calculation of the distribution in depth

of primary (electron excited) x-ray production. The approach will be

personal and selective rather than objective and exhaustive. First, we analyze three quite different computational approaches which

have been tried with some success. Secondly, we consider the

common body of physical theory on scattering, energy loss, and

ionization phenomena which is used by each of the computational

methods. Then we will compare the predictions of theory with

various experimental data and attempt a judgment of the status of

the theoretical (and experimental) research program. Finally, a few

comments on several courses of action which might or should be

followed up.

* Presently at Naval Research Laboratory, Washington, D.C.

63
64 ELECTRON PROBE

II. Theoretical Discussion

A. THREE COMPUTATIONAL TECHNIQUES

We shall be interested in the bombardment of a homogeneous

j semi-infinite solid target with electrons of perhaps 30 keV. Before ! beginning let us introduce three fairly reasonable simplifying I assumptions. First, the impinging electrons will be assumed to lose

' energy only through collisions with atomic electrons. Second, they I will be assumed to be deflected only by two—particle elastic ! scattering interactions with the field of the atomic nuclei. Third, | after an electron has lost a certain energy to the target, the path

j length it has traveled in the target will be represented by the mean [ path traveled by electrons while losing this much energy. Each of

j these simplifications may be somewhat relaxed, but it is the fact that i these are a reasonable schematization which gives this problem such

| simplicity as it possesses. Two additional properties of this physical j process can often be used to simplify analysis. They are the facts

j that scattering is predominantly into small angles, and that after the f electrons have been frequently scattered their travel becomes a I diffusion process. |i The Transport Equation: i The travel of high-energy electrons in solids may be handled with

a Boltzmann transport equation. The essence of this treatment is that one may treat the particles not individually but rather with a

'

"distribution function"

f(f,v,t)

^ which is the probability of a particle at time t lying within d^'r aroundj!

r and having a velocity vector lying within d^v around v. If wel' assume a one-to-one relation between path traveled, s, and velocity,!' v, then the same information will be given by

r f(f,u,s) I

! where u is a unit vector in the direction of motion. The time and the^ magnitude of the velocity are both specified by the distance the|^,

electron has traveled, s. Now, the equation of motion for the; distribution funcfion, the transport equation, is

jj

(d/ds) f(f,u,s) = -u.V,f(r,u,s) + ( N J [or(a,v) sin a da df3] [f(r,u;s)-f(f,a,s)]
BROWN 65

(N is the number of scatterers (atoms) per cm^; cr(a,v) is the cross

section for scattering of an electron of velocity v through angle a;

sin a da d/3 is the solid angle lying between a and a plus da. /3 and

|3 plus d/S where /3 is the azimuthal angle in spherical coordinates; u'

is some other direction of motion making an angle a with u). In this equation the first term on the right hand side represents convection

or streaming, the first term in the integral represents scattering into the solid angle at u and the second term represents the scattering out

of it. This very complicated differential-integral equation can be

much simplfied by introducing the "small angle approximation".

The scattering terms are given a series expansion and, recalling that scattering is predominantly through small angles, we retain only

id/ds) f(r,u,s)= -u • Vrf(r,u,s)+(l/A)V„' f(r,u,s) (2)

where k is the momentum mean free path

(l/A.) = 7rN /sin a da cr(Q:.v)(l-cos a) (3)

Furthermore, we shall consider only the distribution in depth below

the specimen surface. This reduces the number of independent

variables from seven to only three, viz

id/ds) f(x,d,s)= - cos e id/dx) f(x,e,s) +

(l/\)(l/sin end/dO) [sin 6 (d/dd) f(x,0,s)] (4)

where 6 is the angle between the direction of motion and the internal

normal to the specimen surface. This equation appears much less formidable and can in fact be solved numerically given A as a

function of v, and v as a function of s [1 ,2]. Knowing f(x,^,s) it is not

difficuh to calculate the distribution in depth of primary x-ray production given the probabilities for ionization of the relevant

atomic shell. The numerical solution also yields very interesting

information on the distribution in energy and angle of electrons

backscattered from the specimen.

It is useful to know that after a large number of collisions the

transport equation may be well approximated by a diffusion

equation. We define the total electron density at a given position

r+TT F(x,s)= f(x,6»,s)[27rsined6»] (5)

and the current density

J(x,s)= [cos e'f(x,e,s)] [277 sine d^] (6)

•'-77
66 ELECTRON PROBE

Then when

j

(1/J) (dJ/ds) « (1/A)

j

it may be shown [3] that j

\ (dF/ds) = (A/6) ((9^F/(5x') (7)

j where \/6 is of course a diffusion coefficient. Note that in this i' transformation we have eliminated one more independent variable « and have obtained a much easier equation to work with.

jj Moment Methods:

Spencer [4] , elaborating on the methods of Lewis [5] . has solved III the Boltzmann equation in terms of the moments of the electron |l| distribution without using the small angle approximation, j Unfortunately this solution is for "scattering media which are|

homogeneous and without boundaries." Here the transport equation it

is attacked by an expansion of f{\,d,s) and cr(a,v) in spherical jl harmonics. These expansions are substituted into the transport !l equation leading to a linked system of differential equations in terms i of the expansion coefficients. These coefficients are

f,(x,s)= 277|^^d(cos d) P,(cos 61) f(x,0,s) (8)^

r + l o-;(v) = 277l d(cos a){ 1-PKcos a)}c7-(a,v) (9)!

where the Ph(z) are Legendre polynomials. This series of equations

has not been solved for the f/(x,s) but it has been solved for th^

spatial moments of the expansion coefficients

roc

finis) = I dxx"f,(x,s) (lO:

It is easy to see, for example, that the mean depth for a given value

of s is

<x(s)) = f„,(s) I

since P„(z)=l. Metchnik and Tomlin [6] have treated x-rajji production using a simplified version of Lewis' theory. They us&

only his mean depth, which may be written

<x(s)) = foi(s)=f dsexpT-f (2/\)dsl

Jo L Jo J I
BROWN 67

where k is again the momentum mean free path (a function of v and

therefore of s). As the Metchnik and Tomlin treatment is rather

overly simple we shall not consider it further. The Spencer

treatment may be useful for our problem in cases where the effect of

the boundary at x = 0 can be neglected. Its principal advantage

appears to be its avoidance of the small angle approximation. From

the point of view of computational difficulty it appears to be at least as troublesome as the other techniques that we shall discuss.

Monte Carlo Methods:

The Monte Carlo technique has a quite different structure from

I the two just described. It does not deal with a distribution function

I but rather makes a random sampling of calculated paths of

individual electrons. The simulated electron trajectories are generated by using random numbers to determine the new direction

and energy of an electron after each scattering event by sampling

from the appropriate scattering distribution, and also to determine

the distance the electron travels between events. The technique as

just sketched is often prohibitively expensive in computer time, and

in order to reduce the required amount of computation it is common

to abandon the complete description of particle histories. In this approximation the availability of analytical solutions for certain

aspects of the multiple scattering problem is utilized. A

"condensed" history is sampled by letting the particle carry out a random walk in which each step takes into account the effect of

many collisions [7].

For instance, in the treatment of Bishop [8] of our problem the

electron trajectory is divided into 25 steps. The electron is assumed

to scatter at some random fraction of the step length through an

angle selected from a scattering distribution given by GoudsmitSaunderson multiple scattering theory [9]. The latter gives the

angular distribution of electrons having traveled a distance s in terms of a series in Legendre polynomials. (We shall give a bit more

detail on this theory below.) The physical assumptions used by

Bishop in his Monte Carlo calculation [10] are very similar to those

used in the numerical solution of the transport equation [1,2]. The

only clear difference is that the Goudsmit-Saunderson theory does

not use the small angle scattering approximation. Differences

resulting from this fact would be expected to show up most clearly in

i the energy distribution of backscattered electrons. This is due to the
68 ELECTRON PROBE

fact that the small angle approximation is expected to underestimate

the large angle scattering (5). These differences have not been

observed, as will be discussed below. As used in the above

examples, the transport equation solution appears to be slightly more efficient than the Monte Carlo solution. This is no doubt partly

due to the ability to shift to a diffusion approximation to the

transport equation when sufficient scattering has taken place.

Unfortunately a comparison of the efficiencies of the two techniques

is a bit speculative because of the difficulties of comparing work by

different programmers on different computing machines.

B. SINGLE AND MULTIPLE SCATTERING THEORY

Let us look briefly at the theory of electron scattering available to be introduced into the computational schemes outlined above. A

quantum mechanical treatment using the Born approximation (a first order perturbation theory) gives the curious result that the cross

section for scattering of an incident electron by the nucleus is given

correctly by the classical Rutherford cross section. The Bonij^

approximation is better as one goes to high energy electrons, to low

atomic number nuclei, and to small scattering angles. Comparison!

with the more accurate Mott theory [11] indicates that thej; Rutherford scattering cross section for a scattering angle of 1 80° and

an electron energy of 50 keV is 20% high for Al and 225% low foi] Pb. The discrepancies are very much smaller for the predominant

small angle scattering. A further problem is that the Rutherford

cross section blows up as the scattering angle goes to zero (as the

impact parameter goes to infinity). This difficulty can be overcomej

by taking into account the fact that the Coulomb field of the nucleus is shielded by the atomic electrons at large scattering

parameters. This introduces the problem of choosing a reasonably

representation of V(r), the atomic field. For atoms which are nol too light one may use the Thomas-Fermi statistical atomic model

where

V(r) = - (ZeVr) 0(r/^)

11 = 0.885 ao Z-'/^

So = first Bohr radius of H

= 0.529 K

The function <^(r//u.) has been tabulated. Unfortunately it is known tO| be inaccurate for large values of rlfx [12]. This will show up in the small angle (large impact parameter) scattering. The Hartree-Focl|

field is better for low Z and large r but its application can be i
BROWN 69

I

I lengthy procedure. Moreover, neither of these theories take into

I account the modification in the potential due to solid binding. This

! too will affect the small angle scattering. Massey [13] suggests that

I the following approach may be "as accurate as the neglect of

I modifications due to the solid justifies, except for the lighter atoms."

We approximate the Thomas-Fermi field by

(/)(r/)Lt) = e-^'-/M (13)

! where c is an empirical constant of order unity. Using the Born

j approximation this yields (in non-relativistic form)

' cr(a) = (Z2e4/4m2v4)[sin2 (a/2) + iS^J-^

/3 =0.565 Zi/3c(27re2/hv)

^^^^

Note that (3^ is a damping constant which prevents cr(a) from blowing

j up as a goes to zero. Note also that this is a conveniently simple

j form for o-(a). In particular it draws from Thomas-Fermi theory the

i property that one equation applies to all atomic numbers (if they are

I not too small). In any treatment of our problem account must be taken of the

probability that an electron may scatter more than once. In Eq. 8,

containing the small angle approximation, this process is covered by

the Laplacian term

(1/\)V„' f(f,u,s) where the cross section for single scattering is contained within A.. Substitution of Eq. 14 into Eq. 3 yields, neglecting small terms

( 1 /X) = (TrNZ^eVm^v^) [ (1 1(3^)- 1 ] (15)

Note that the damping constant is contained in a logarithm. This

* somewhat reduces the sensitivity of X to a proper choice of the

empirical constant c which appears in {3. One good way of evaluating

I c is by comparison with a numerical determination of A using a Hartree-Fock potential. In the Goudsmit-Saunderson multiple scattering theory used by

Bishop [9,8] a property of Legendre polynomials is exploited. If 9i

is the deflection after one impact and 9 is the total deflection after n

impacts then

I (P,(cos6»)) = (P,(cos0,))"

] That is, the average value of any polynomial after n impacts is equal

to the n th power of the average value of that polynomial after one
70 ELECTRON PROBE

impact (providing that the scattering law is cylindrically

symmetrical). The Goudsmit-Saunderson work is a predecessor of

the Lewis work and is closely related. It concerns itself only with

the angular distribution, yielding

oo F(0,s) = /f(r,u,s)dr = (l/2i7) ^ (I + 1/2) P,(cos 6) 1=0 H

X exp .N o-,(v)ds (16)

Note again that cr,(v) is a generalization of l/\ (compare Eqs. 3 and

9, and Eqs. 1 1 and 16). Once again this solution is for a medium with no boundaries, and ^ = 0 corresponds to the initial direction of the

electrons. Note finally that the Goudsmit-Saunderson theory retains

the details of any chosen single scattering cross section in the

various ai{\).

One of the virtues of a numerical solution of a problem is the ease! with which one may make a judicious combination of techniques,

using each in that portion of the problem for which it is best suited.; For example, the following approach has been found useful. First

the electrons are allowed to penetrate a very short distance into the|

target and to assume an angular distribution given by the cross

section for single scattering. This avoids the small angle

approximation in a region where it is most important. Then the

electrons are allowed to proceed as predicted by Eq. 4, the transport

equation with small angle approximation. Finally, after considerable

scattering has occurred the electrons proceed as predicted by Eq. 7,

the diffusion equation. This scheme seems to strike a nice

compromise between rigor and computational efficiency.

C. ENERGY LOSS AND STRAGGLING

The assumption of a one-to-one relationship between the energy

of an electron and the distance it has traveled in the target is almost

always made. In fact it can be shown that electrons must have ^

distribution of energies which is approximately Gaussian with a hall width at half maximum equal to about

AV=0.126 V Z(V,-V) (17)

where V is the mean energy (in keV) of the electrons after having

traveled a certain distance and Vo is the initial energy (s = 0). The

effect of energy straggling is difficult to assess. It may be reasonec

that straggling is most pronounced after the angular distribution ha^

become nearly isotropic and thus the effect of a distribution oj

values of X is minimized. The effect of straggling must be mos]
BROWN 71

pronounced in the distribution of electrons at considerable depths

below the surface. This is clearly so since electrons which have lost less energy than average can travel farther. This is probably not too important for our problem since x-rays produced at great depths are heavily attenuated. Some rough correction for straggling can be

attempted by allowing some fraction of the electrons to travel a bit farther than normal and some fraction to travel a bit less far than

normal, but the effect of such a correction on the distribution in depth of x-ray production is small. The usual range-energy relation is

s = r°(dE/ds)->dE (18)

-'e where the mean rate of energy loss dE/ds is taken from Bethe's

theory, one simple non-relativistic form of which is -(dE/ds) =(27re4N/mv2) Z In (m^v^/P) (19)

where I is an empirically determined average ionization energy.

Two brief comments on Eq. 1 9. First, the values to be used for I are

still in contention [14]. Moreover, the values for I are determined

for energies much greater than the K shell ionization energies. What

is to be done for energies lower than this is not completely clear. This is of interest for the calculation of production of L lines, but

j fortunately this is usually of interest for heavy elements where the

I fraction of K shell electrons is small. Secondly, experimental checks

of the Bethe law [15,16,17] give no clear idea ofhow good it is. The

work of Bichsel [ 1 8] implies that the expected accuracy should lie between 1 % and 5%. Now, a comment on Eq. 1 8 which contains the

implicit assumption that (ds/dE)=(dE/ds)-i

Since energy loss is not a continuous process this is not strictly true

but an approximation. Spencer and Fano [19] have treated this problem in some detail. A first approximation solution of SpencerFano theory to the same non-relativistic approximation as Eq. 1 9 is (ds/dE)= -[(27rNe4/mv2)]-i[Zn (4V2/P)+ 1 - In [VAVq-V)] (20)

Note that this equation tends to blow up as V approaches V„. This

correctly indicates a reduction in the rate of energy loss in the

1 vicinity of Vo. This results from the fact that energy losses greater

than V„-V are not possible. A mean range determined from a version
72 ELECTRON PROBE

of Spencer-Fano theory has been applied to our problem [2]. The ) effects on the distribution in depth of x-ray production are not

striking. The maximum in the energy distribution of back scattered

electrons does shift to higher energies, improving agreement with

experiment. 1 D. IONIZATION CROSS SECTIONS, COSTER-KRONIG, ETC. |' To calculate the distribution of x-ray production from the electron

j, distribution function of course requires information on ionization . probabilities. The fact that in microprobe work one is almost always

using ratios of intensities serves to reduce the sensitivity of the ! problem to the details of these probabilities. This is fortunate, since

both the experimental and theoretical work in this area are in an

unsatisfactory state. A combination of theoretical and experimental

considerations suggest that the cross section for K shell ionization

may be roughly represented by the form

Qa- varies as (1/Va-2)(Va/V)" (V/V^) (21)1

where n is a constant of the order of one. The constant of^

proportionality is not necessary for the determination of a ratio of

intensities. The situation for L lines is less satisfactory. For lack of a I better solution it is usually assumed that Q/, has the same form as

Qa. Furthermore, in the case, for instance, of Lm ionization one

really should account for the probability that an L, ionization may

make a non-radiative transition to an Lm ionization. To do this one

needs the Coster-Kronig coefficients giving the transition

probabilities (not well known) and also the ratio Q/. mlQi. / (not well

known). Once again, the effect of these uncertainties is somewhat^

reduced by taking intensity ratios. Finally, if one wishes to calculate! the absolute intensity of x-ray production one needs to know the constant of proportionality for Eq. 2 1 and to know the fluorescence

yield factors. These latter are not well known for low atomic'

number.

E. IONIZATION DUE TO FLUORESCENCE

] Secondary ionization may occur as a result of fluorescence by the|

continuum or by sufficiently energetic characteristic lines. The latterif

is usually of importance only when the exciting line is close to the; ionization energy of the excited line. This effect has been treatecji

well enough for our purposes by Reed [20]. Fluorescence due to the|(

continuum can also be treated approximately. In this case thd i

I

I
BROWN 73

mathematics may become very tedious, especially when there are many absorption edges between the ionization energy and the short

wavelength limit. Nevertheless, the key physical assumptions

involved in this treatment may be stated concisely. All of the

exciting radiation is assumed to be produced at the surface and to

travel in all directions with equal probability. Thus half of the

intensity is immediately lost from the target. The number of

continuous quanta per electron located between A. and X plus dA. is assumed to follow a law like

dNc(\) = 34.2xlO-«Z ^~^''"^ dk

where Xswl is the short wavelength limit of the continuous spectrum.

in. Experimental Justification

We have discussed some of the possibilities and problems basic to

the calculation of the distribution in depth of x-ray production. Now

let us see if we can make a judgment as to the success of such

calculations by comparing predictions with experimental results. In Figure 1, the predictions of the transport equation program

(TEP) [2] are compared with the results of Castaing and Descamps'

tracer experiment [21]. The agreement is encouraging. The

differences for Au (Bi tracer) at low mass-depths are thought to

result from the use of a somewhat too thick tracer layer in the

experiment. It is not really clear why the calculated x-ray

production lies as far as it does above the measured in the case of Cu

(Zn tracer) at large mass-depth. Figure 2 compares the tracer experiments of Castaing and H6noc with the predictions of the TEP

and of Bishop's Monte Carlo program [22]. Here also the

agreement is sufficiently good that it is difficult to decide in what

ways the theory may be superior or inferior to the experimental

data. In Figure 3, we look at the energy distribution of backscattered electrons. Here the TEP and Monte Carlo predictions

are compared with the measurements of Kulenkampff and Spyra

and of Bishop [23,8]. The Kulenkampff and Spyra data have

been normalized so that the total backscattered fraction agrees

with that measured by Bishop [8]. It is interesting that the TEP

1 and Monte Carlo results are very similar. This would seem to

i indicate that the introduction of the small angle approximation

295-798 0-68—
74 ELECTRON PROBE

0.5

o

-0.5

-1.0

1.5

\ \

^

f Al

Castaing a Descamps < Cu

\

1 Al

Transport Equation Program \

^ Al (Cu tracer)

0 Cu (Zn tracer)

D Au (Bi tracer)

^ 1 0.5 1.0

yox (nng/cm^)

1.5

Figure 1 . Distribution in depth of primary x-ray production. Initial electron energy,

29 keV. Normal incidence.

into the transport equation is not serious. Figure 4 compares

the predictions of the TEP of the absolute intensity of

emerging x-radiation from Al at a takeoff angle of 15.5°. The

experimental data have been previously reported [24] but the' voltage has been recalibrated and the Heinrich absorption

coefficient [25] has been used. The agreement is surprisingly good';

since the fluorescence yield factor for Al is uncertain (we use^'' .0267). In Figure 5, we show the calibration curve {\nn„yl\pure versus' weight fraction) for Ni Ka radiation in the Fe-Ni system. Here the predictions of the TEP are compared with the measurements oi Goldstein [26] and with calculations using the absorption

corrections of Green [27] and Castaing and Descamps [21]. The

surprising thing here is the degree of disagreement between Greer

and Castaing and Descamps. The takeoff angle was 15.5°. Figure 6 makes a similar comparison with Ziebold's measurements for thf
BROWN 75

0.5

0 0.5 1.0 1.5 px (mg/cm2)

Figure 2. Distribution in depth of primary x-ray production for Al with a tracer of Mg. Normal incidence.

Au La line in Cu-Au alloys [28]. Here we found it necessary to make a correction for secondary ionization due to the continuum. It

is calculated that at this takeoff angle (52.5°) 15.3% of the measured

radiation is due to secondary ionization in the case of pure Au.

The previous comments have indicated the need for more precise

experimental work. From the point of view of judgment and

improvement of the theoretical work, we are most in need of better

data on the energy distribution of backscattered electrons and on the

distribution in depth of x-ray production. Also, as has been

indicated, the data on ionization probabilities are definitely in need

of work.

IV. Conclusions

A. ANALYSIS OF THE THEORY

In our judgment the major weakness of the theory at present lies

in somewhat questionable schematization of the scattering process.
76 ELECTRON PROBE

3.0

1.0

0.5

0

0 TEP

A

Bishop measured

K a S (normalized)

* Bishop Monte Carlo o J

*Q 7

0 /

/ / o// <

p ^

/ 1

/ /

o n\

-o-o-

\ \

\ 0 \

0 0.2 0.4 0.6 0.8 1.0

Figure 3. Energy distribution of backscattered electrons. W is V/V,,. The curves

are, in ascending order, for Al, Cu, and Au (with the exception of the Kulenkampff

and Spyra data where the upper curve is for Pt). I

i Some improvement might be expected from the introduction of a more reaUstic atomic potential and from correction for the Born

approximation and the small angle approximation. Thesej

modifications do not appear to be easy. Two possibilities come to mind. First, one can imagine using a Thomas-Fermi-like potential

which took better cognizance of the presence of the atom in a solid. Secondly, it might be possible to introduce the Spencer momentji

method during the early stages of electron travel where the^ limitation of infinite scattering media is of less importance. This?

would allow a more exact use of the single scattering cross sectioiT' during a critical region. A generalization of the theory which would'! be most interesting would be to determine the three dimensiona | distribution rather than just the distribution in depth. This greatlj

complicates the problem. In the case of the transport equation one goes from three to seven independent variables. Further, it would bf interesting to remove the restriction to homogeneous scattering

media. No doubt this could be handled, but the computational effor appears excessive at the moment.
BROWN 77

40

30

20

z 1^

/

/

-»

//

///

/

* /

/

/

/

/

o experimental

A TEP

1 10 20 30 40

KV

Figure 4. Variation with voltage of x-ray intensity emerging from an Al target at a

takeoff angle of 15.5°. Absorption coefficient from Heinrich. Fluorescence yield

factor, 0.0267.

B. COMMENT ON APPLICATION OF THE THEORY

The art of making corrections for quantitative analysis with the

microprobe (empirical calibrations aside) has become polarized

around the absorption, fluorescence, and "atomic number"

corrections. This division has proven useful, but it is perhaps well to remind ourselves again that it is somewhat artificial. For instance, in the calculations leading to the TEP results in Figures 5 and 6, the

atomic number and absorption correction factors did not enter

explicitly. The calculation proceeded directly from an integration over the distribution in depth of primary radiation. Ideally, the easy

availability of reliable computer calculations of the x-ray

distribution will render these concepts excess baggage. It is not yet

clear that we have reached this state.
78 ELECTRON PROBE

0.5

0.4

0.3

0.2

0.1

Exp. points fr( 0 Calc. absorptic

0 Calc. absorptic

A TC-O

}m Zlebol

n correct

)n correct

d a Ogilvie due to Goldstein

ion using Green's f(x)

ion using Ca D's f (X)

0.2 0.3

C

0.4 0.5 0.6i

Figure 5. Calibration curve for Ni Ka radiation in Fe-Ni alloys. C is the weighl

fraction of Ni. K is the intensity ratio l„iioJi,>ure- Incident electron energy, 30 keV

Takeoff angle, 15.5°.

1.4

1.2

C/K

1.0

0.8

0

'—

&

—o— From Ziebold thesis, fl

A TEP

0 TEP corrected for seco

g. 4A

ndory ionizotio n due to contin jum

0.2 0.4 0.6 0.8 1.01

Figure 6. Calibration curve for Au La radiation in Cu-Au alloys. C is the weigh

fraction of Au. K is the intensity ratio l„ii„ylii>ure- Incident electron energy, 30 keM

Takeoff angle, 52.5°. !
BROWN 79

V. References

Brown, D. B.,and Ogilvie, R. E.J. Appl. Phys. 37,4429(1966).

Brown, D. B, and Wittry, D. B., presented at the Second National Conference on Electron Microprobe Analysis, Boston, 1967. Bethe, H. A., Rose, M. E., and Smith, L. P., Proc. Am. Phil. Soc. 78, 573

(1938). Spencer, L. v., Phys. Rev. 98, 1597 (1955). Lewis, H. W., Phys. Rev. 78, 526 (1950). Metchnik, V., and Tomlin, S. G., Proc. Phys. Soc. 81, 956 (1963). Berger, M. J., Methods in Computational Physics. Vol. 1 (Academic Press, New York, 1963), p. 135. Bishop, H. E., X-Ray Optics and Microanalysis, (Hermann, Paris, 1966)

p. 112. Goudsmit, S., and Saunderson, J. L., Phys. Rev. 57, 24 (1940). For a detailed treatment of this see H. E. Bishop, Ph.D. Thesis, University of Cambridge, 1 966. See also Ref. 8. Reviewed by R. D. Birkhoff, Encyclopedia of Physics Vol. XXXIV (SpringerVerlag, Berlin, 1958), p. 53. Mott, N. P., and Massey, H. S. W., The Theory of Atomic Collisions, 3rd ed. (Oxford U. Press, London, 1965), p. 462. Massey, H. S. W., Advances in Electronics, Vol. IV (Academic Press, New

York, 1952), p. 1. For a recent discussion of this see the paper by J. E. Turner, Studies in Penetration of Charged Particles in Matter, Nuclear Science Series Report

Number 39, NAS-NRC Publication 1133 (available from the National Academy of Sciences), p. 99. Feldman, C, Phys. Rev. 117, 455 (1960). Holliday,J. E.,and Sternglass, E. J., J. Appl. Phys. 30, 1428(1959).

Cosslett, V. E., and Thomas, R. N., Brit. J. Appl. Phys. 15, 1283 (1964).

Bichsel, H., NSS Report 39 (see Ref. 14), p. 17. The reader is cautioned that

this work refers to heavy particles of about the same velocity, but therefore of much higher energy than the electrons of interest to this paper. Spencer, L. V.,and Fano, U., Phys. Rev. 93. 1172 (1954). Reed, S.J. B., Brit. J. Appl. Phys. 16. 913 (1965). Castaing, R., and Descamps, J., J. Phys. Radium 16, 304 (1955); and Castaing,

R., Advances in Electronics and Electron Physics, Vol. XIII (Academic

Press, New York, 1 960), p. 3 1 7. Castaing. R. and Henoc, J., X-Ray Optics and Microanalysis, (Hermann,

Paris, 1966) p. 120. Kulenkampff, H.,andSpyra,W.,Z. Phys. 137,416(1954).

Brown, D. B.,and Ogilvie, R. E.,J. Appl. Phys. 35,309(1964).

Heinrich, K. F. J., The Electron Microprobe (Wiley, New York, 1 966), p. 296. This data due to J. I. Goldstein was taken from T. O. Ziebold and R. E. Ogilvie, Anal. Chem. 35,621 (1963). Green, M., X-Ray Optics and X-Ray Microanalysis (Academic Press, New

York, 1963), p. 361. Ziebold, T. O., Ph.D. Thesis, Massachusetts Institute of Technology, 1965.
Ii \1I

r'
THE CHOICE OF MODELS FOR ELECTRON

SCATTERING AND DECELERATION FOR

ELECTRON PROBE MICROANALYSIS

T. MULVEY

Department ofPhysics, The University ofAston in Birmingham, England

Abstract

The general physical picture of the interaction of the electron

beam with the specimen in the x-ray microanalyzer is clear. Nevertheless, many of the numerical results yielded by even the

most successful theoretical calculations fall outside the range of

experimental error. An improvement in this position can be attained

in principle but only at the expense of long and tedious calculations.

However, if one is prepared to limit the field of application of a

model on an empirical basis or introduce plausible assumptions,

surprisingly accurate quantitative analysis can be performed in

practice. The present paper reviews various models of this type, and

makes some suggestions for further work.

I. Introduction

Electron probe microanalysis is now a commonly accepted tool in quantitative microanalysis. Many difficult technical and

instrumental problems have been overcome in recent years, so that a

remarkable range of specimens can now be examined. For many

purposes an approximate idea of the concentration of an unknown

element is adequate, but eventually all electron probe users are

faced with the problem of providing a quantitative answer, to a

relative accuracy of perhaps one or two percent. It is at this level

that the real difficulties begin. There are many reasons for this in

practice.

11. Discussion

A. INSTRUMENTAL ERRORS

Among these difficulties may be mentioned instrumental

shortcomings such as electrical and mechanical drifts and

instabilities. Field tests on groups of instruments made by the

Midlands probe users group suggest that errors from these causes of

81
82 ELECTRON PROBE

^ up to 5% are not uncommon in day-to-day working, but can bejj overcome with time and care. Other errors can arise from errors in the data needed for applying various corrections. An obvious

example is that of mass absorption coefficients in the soft x-ray

region. Errors of 100% in this region have been suspected at times!

when corrections are being applied to the measured carbon content/

of uranium carbide, for example. \

B. GENERAL CONSIDERATIONS ABOUT MODELS I' The present contribution is not concerned with errors of this type

as they contribute only incidentally to error in quantitative analysis,

However, there are certain experimental errors which are more

insidious and which may influence profoundly the performance of £ particular model which forms the basis of the correction procedure

For example, the fraction rj of primary electrons backscattered fron a pure element is an important parameter in any empirical method oJi quantitative correction. In some models, experimentally determine(

values of backscattering coefficient are built into the method. Thi accurate measurement of this simple ratio is surprisingly difficult t<|i carry out in practice. The two most recent and carefiji

determinations by Philibert and Weinryb (1962) [1] and by Bishoj

(1966) [2] lead to coefficients that differ by more than 10 percen

for heavy elements. A similar situation arises in the more comple;

experimental measurement of the distribution as a function o energy of the backscattered electrons. For example, the widely use<( experimental results of Kulenkampff and Spyra (1954) [3] canno

be reconciled quantitatively with those of Bishop (1966) [2]

Nevertheless, both sets of data have been successfully put to use ifi various correction procedures.

C. IDEAL REQUIREMENTS OF A MODEL

Ideally this state of affairs should not arise. A genuine theory Cj electron probe analysis should be based on more fundament

considerations such as the electron scattering and x-ray emittir^ properties of atoms in metals. Unfortunately it must be admitte|

that we are not yet in possession of a comprehensive theory c electron interaction with metals. A quotation from Professor S. Fp

Edwards (1967) [4] in a recent article entitled "How do electror'

really behave in a metal? " runs as follows: "In conclusion I woul

say, if I were a pessimist, that metal theory has passed into the sani| state of knowledge that classical liquid theory entered many yeaii
MULVEY 83

ago. The picture is there but the numbers are not. If an optimist, I would say that our knowledge is so good that it is really up to

theorists to show why it all works (notwithstanding the comments

above) as well as it does."

In many ways this statement could serve as a summary of the

closely related subject of the present state of the theory of electron

probe analysis. It is still possible to take on logical grounds either an

optimistic or a pessimistic view of the possibility of deriving all the

corrections for quantitative analysis entirely from basic principles. In the meantime samples for analysis are accumulating around the

instruments, and quantitative results must be declared with

confidence.

D. TWO APPROACHES TO CORRECTION PROCEDURES

It is not surprising therefore that two approaches to the subject

may be discerned which will certainly influence the choice of model

and which are inspired by (1) the need to obtain at all costs the

correct result in the quickest and most certain manner possible in [the knowledge that considerable liberties have been taken in the

i process and (2) the ultimate necessity of understanding in detail the

underlying physical principles of electron probe analysis so that new

situations can be tackled with confidence. In the limit the first approach calls for the production of a close range of comparison

j samples thereby eliminating the need for any corrections. It is of

(course difficult to make the range of standards. In the limit the

! second approach substitutes for the close standard merely the name

of the pure standard element. Most correction methods at present in use rely more or less heavily on calibration procedures inasmuch as they contain adjustable constants whose value is determined from

experimental measurements on test alloys. For this reason the fact

that a particular model or correction procedure leads to the correct

analytical result, although extremely consoling, does not necessarily

constitute a fundamental advance and may even be invalidated by

' the arrival of more accurate data. It is therefore useful to analyze

empirical methods, successful or otherwise, with a view to

: discovering their useful area of application.

E. PHYSICAL PICTURES AND QUANTITATIVE THEORIES

In discussing theories of electron probe analysis it should be

recognized that the real difficulty is to obtain a detailed numerical

theory to account for the strong interaction of the primary electrons
84 ELECTRON PROBE

with the atomic nucleus and its associated strongly bound electrons^ of comparable energy in the inner shells. It is not surprising that the^ greatest progress in the quantitative theory has been in the area ofli weak interaction such as occurs in secondary fluorescence of theii specimen by characteristic or continuous x-rays. In his originalj.

derivation of the theory Castaing (1950) [5] preferred to deduce anj* approximate theory using the experimentally inspired laws ov

electron retardation of Williams and of Webster. These have thejf great advantage of leading to the correct answer (to a firstfi approximation), as revealed by subsequent experiment, whilst

avoiding several awkward physical problems such as the precis^ nature of the energy loss process and scattering of electrons in thej target.

" The physical basis of electron probe analysis put forward by'

Castaing and Descamps (1955) [6] was more solidly based relying' as it did on the experimentally determined distributions of generateci x-ray intensity with depth by the tracer method. The generalizatioi^

of these results led to a satisfying physical picture of the physical

processes that are at work. Nevertheless it should be emphasizec

that a correct physical picture is not synonymous with a detailec quantitative theory. For example, a knowledge of the electror density distribution on pure metals does not make it immediately

obvious how to analyze an alloy. In fact the labor of calculating accurate electron distributions in pure elements alone is considerable.

Thus the early controversies about the existence or not of aii "atomic number effect" could not be resolved simply by inspectini

these experimental distributions. It is always possible of course tha|

refinements of technique may make it feasible to obtain an adequate,"

number of electron distributions in alloys but at the moment thi'j approach does not seem to be yielding sufficient data to eliminate

the need for accurate calculations.

Another approach might be to measure the intensity o

characteristic radiation from a sample as a function of take-off angle

Knowing the mass absorption coefficient of the material t\

required distribution could be found. Because of purely mechanicaj;

difficulties and lack of precision in mass absorption data thi:, experiment cannot be performed to the necessary accuracy. In fact by means of such experiments one can quickly realize that unde i typical operating conditions f(x) curves (x=(/>i/p) cosec 6) are no
MULVEY 85

very sensitive to the precise form of the electron distribution with

depth. Several authors have of course taken full advantage of this

fact when calculating f(x) curves from comparatively crude electron

models. None of the present models, including the most Monte

Carlo methods, is equally accurate for all values of x or for all elements. This suggests that, as more accurate (/i/p) values become

available it may be possible to refine the experimental technique to

the point where it might provide useful information about the

electron distribution with depth especially for soft radiations.

F. THE NEED FOR A VARIETY OF MODELS

Since it has not yet proved possible to consider all corrections

simultaneously either experimentally or theoretically, it is necessary

to consider them piecemeal. Consider the intensity ratio H/I[A]

measured from sample which contains a weight fraction Ca of

element A.

Qk (E) _dE

r Ca fJX) E„ (dE/ds)

I[A] fA(X) Ra ^Ek Qk (E)

(1)

g

(dE/ds),

Here f(x)s refers to the sample and f(x).4 to the pure standard. Qa(E)

is the ionization cross-section for K(or L, M, N, etc.) radiation

(dE/ds) is the electron "stopping power", Rs is a backscattering

factor that takes care of the fact that some electrons leave the

material with an energy greater than the critical excitation potential

Ea. Eo is the initial potential of the electron. Here s refers to the

mass/unit area (density x distance) traversed by the electron along

the trajectory.

It should be noted that it is not necessary or even desirable to use

the same model for each factor. For example, if the value of f(x) is greater than 0.2 the quickest procedure for adequate accuracy is usually the Philibert (1962) [7] expression.

1
86 ELECTRON PROBE

with o- given by Duncumb and Shields ( 1 964) [8] as

2-39 X 10^ and h =

(3

It should be mentioned that this expression is based on a mode

that assumes that the ionization cross section Qk does not vary wit|

kilovoltage and is therefore likely to be inaccurate where the over

voltage ratio E/Ea and mass absorption coefficients are high e.g. il, light element analysis. In such a case a model which employs a morj^ exact value for Qa but is perhaps less satisfactory in other respect^

is likely to be more accurate. In many practical cases however, equation ( 1 ) can be written

I [A] f^ix) Ra Ss 1

where S represents a suitably averaged stopping power in the targe or pure element. Poole and Thomas (1964) [9] have taken fu: advantage of this simplification in their method, which in its valii- range of application does not require a knowledge of Qa. It may bj; remarked here that the R values assumed by these authors do nq

agree with those recently determined by Derian (1966) [10] so tha^ some readjustment of the other parameters may be needed to taki this into account. The general result is that the atomic number effecJ; tends to be overestimated by Poole and Thomas. The chief factor^, to be considered in quantitative analysis then are the stopping powei

dE/ds and the backscattering coefficient R. These factors vary witi atomic number in such a way as to produce an enhancement of th},, x-ray intensity from the light element in a heavy matrix and j, depletion of that from a heavy element. The effect is noticeable fo|; elements of widely different atomic number but can be observej;

(with some difficulty) in the copper-nickel system. Accurati

measurements in this system might well throw some light on th^ atomic number effect. Experimentally it is difficult to isolate thij effect since even a small uncertainty (±5%) in the relevant mas,, absorption coefficients is often sufficient to blur it out. For thij, reason many workers in the field have expressed profountc

scepticism even as to its existence. There is little doubt, howeveithat the high intensity ratios observed from low concentrations o^, light elements in heavy matrices are principally due to this cause. /
MULVEY 87

calculation carried out in 1963 by Archard and the author (unpublished) showed that useful enhancements of several hundred

percent for the carbon content of uranium carbide could be expected

at accelerating voltages of 5 kV and take-off angles in the 30-45°

region. G. THE RELATION BETWEEN STOPPING POWER AND

BACKSCATTERING

The backscattering of electrons is closely connected with

stopping power. In fact, if the trajectory of the electron is known a

separate calculation of backscattering does not arise since the

integration of equation (1) can be stopped at the point where the

electron leaves the target. This method is ideal but places great

reliance on knowing the trajectory. In the target primary electrons

are scattered elastically by the (screened) nucleus and inelastically

(by the atomic electrons). Clearly these processes are complicated

and the loss of energy at each inelastic collision is difficult to

calculate. It is however, possible to calculate a mean free path

between elastic and inelastic collisions, using methods developed for

plectron microscopy and discussed by Halliday (1962) [1 IJ. Elastic

differential cross-sections can be calculated on the basis of

jWentzel's (1927) [12] model which takes some account of the

iscreening effects of the atomic electrons in the nucleus. Inelastic

pross-screening effects can be calculated by the method of Lenz

1954) [13].

! To give an idea of orders to magnitude: at 30 kV the total mean o [ree path (inelastic and elastic events) in gold is about 30 A with a

jnost probable angle of 5 x lO-^ radian for elastic scattering and

X 10-* radian for inejastic scattering. In carbon the corresponding

igures would be 80 A for the mean free path, 3 x 10-^ radian for

lastic and 1.6 x 10-* radian for inelastic scattering. In gold, elastic cattering would be about two and a quarter times as frequent as

lelastic scattering, whereas in carbon, inelastic scattering would

e over four times as frequent as elastic scattering.

A model of this general type should be capable, in principle, of

ielding valuable information in both electron microscopy and probe

lalysis. A difficulty arises, however, in the lack of detailed

formation about the relation between inelastic scattering and

lergy losses. In practice it has normally proved necessary to resort

9 the Bethe (1930) [14] formula which replaces the actual discrete

Isses by a continuous mean loss.
88 ELECTRON PROBE

As a matter of interest, a somewhat simplified Monte Carle

programme by Lauria (unpublished) based on the foregoing treatment has indicated that the above approach can give usefu

results but not of such a degree of accuracy as to justify the prohibitive computing time required.

H. THE BETHE CONTINUOUS ENERGY LOSS RELATION

According to Bethe (1930) [14] the mean energy loss may be written

d(eV) d(eV) ^ NaZg'* , 2eV

= = — Ztt In Wij

d(px) ds eV J

where N,4 is Avogadro's number, Z the atomic number and eV th

energy of the electron, and J is the mean ionization energy of th' atom. Although there are many approximate versions of this la^ which are simpler for hand calculations, most of these achievy

simplicity by obscuring the more fundamental constants. It i therefore worthwhile to examine Bethe's Law in more detail. An alternative treatment (Bethe 1933) [15] leads to a slight!

different logarithmic term in equation (5) namely

("f") ('^)

"^^^^^ ^ =2.718,

the base of natural logarithms. For an excellent discussion of thes

and other related topics see Bishop (1966) [2]. Probably the moi

difficult term to calculate in equation (5) is the mean ionizaticf energy J. Unfortunately in electron probe analysis the range ji energies of the electrons is large and the energies comparable wiffj the binding energy of the atomic electrons themselves; this makin

calculation difficult. Until recently it was generally assumed «i calculation in electron microscopy and probe analysis that expression of the form J :zCkll.5 Z electron volts adequate!]

described the situation, especially as the term occurred as it logarithm. 1 L REVISED VALUES OF J?

Recently this view has been challenged by Duncumb and da

(1967) [16] following a systematic analysis of many Wj

authenticated analyses of microprobe specimens of kno\

composition. By a process of elimination of various errors!
MULVEY 89

correction procedure, these authors have found it necessary to postulate a very different relation between ionization energy and

atomic number from that given above. This suggests that more

intensive study should be made into this question.

Another aspect of the Bethe equation that has been emphasized

by Bishop (1966) [2] in his Monte Carlo calculations, is that the

statistical straggling of electrons in the specimen is ignored in the

Bethe equation and that this could cause errors. This effect is also

thought to be a principal source of error in Green's method using

experimental scattering data from thin films to build up a Monte

Carlo calculation of a solid target, using the Bethe equation to

calculate the energy loss in each film.

It therefore seems feasible that in the not-too-distant future

greatly improved Monte Carlo methods could be available which

would lead to a better understanding of the basic processes in electron probe analysis and also serve as a working basis for more

empirical but simpler methods to be applied in everyday use.

i III. Conclusions

' One of the most important problems outstanding in quantitative

electron probe analysis is the determination of the statistically

varying energy losses in metals. In the meantime, the advantages of

a continuous energy loss model are considerable. The Bethe

expression possibly in slightly modified form appears to be the most

[Suitable for the purpose but serious attention must be given to the

'determination by theory and experiment of the excitation energy J. The most promising way of achieving a soundly based theory of the

microprobe is probably by a Monte Carlo method with improved

scattering cross sections and a modified stopping power relation as described above. In the meantime, less fundamental methods may

be expected to profit from recent improvement in data and give

quick and reliable results, provided that new ground is not being

broken. In these empirical methods it is desirable, but not essential,

pat the basic theory and experimental data be the best available.

The following preferred data are put forward as a basis for

niscussion.

a. Experimental data on the distribution of backscattered

jlectronsby Bishop (1966) [2].

b. Backscattered fraction r) of electrons according to experiments

by Bishop (this is supported by experiments by Mulvey and Page

i5ut not by Philibert and Weinryb).

295- 798 O 68—7
90 ELECTRON PROBE

The combination of a and b leads to R values that agree well with

those determined experimentally by Castaing and Derian but not with those proposed by Poole and Thomas. ! c. f(x) values greater than 0. 1 or 0.2 as determined by the j Philibert/Duncumb-Shields model. For the smaller values than this j f(x) values to be determined by models in which the ionization i cross-section Qa is evaluated as a function of electron energy. Those

j determined by the Monte Carlo method of Bishop would be ap- propriate here, especially for light element analysis (cf. Duncumb ' and Melford 1965).

j d. Scattering data that have proved useful in electron microscopy

and electron diffraction should be used with caution in Monte Carlo

j calculations.

e. Nearly all the models suggested up to now have their place but

it is important to define the limits of applicability.

f. Remarkable agreement between corrected and chemically

determined composition is not necessarily proof that a model is|

soundly based.

j g. As auxiliary data such as mass absorption coefficients are

refined, the need for a sound theoretical model will become more

rather then less urgent. j

I IV. References i

[1] Philibert, J. and Weinryb, E., Proc. Third International Symposium, X-Ray

Optics and Microanalysis, Stanford, 1962, New York, Academic Press (1963) p. 45 1

; see also, Weinryb, E., Thesis, University of Paris (1965).

[2] Bishop, H., Thesis, University of Cambridge ( 1 966).

[3] Kulenkampff, H. and Spyra, W., Zeitschrift fur Physik 137, 416 (1954); see: also, Kulenkampff, H. and Ruttiger, K., Zeitschrift fiir Physik, 137, 426(; (1954). ji [4] Edwards, S. P., Bulletin of the Institute of Physics, London, April (1967).

j [5] Castaing, R., Thesis, University of Paris (1950).

[6] Castaing, R. and Descamps, J., The Physical Basis of Electron Probe

Microanalysis, J. Phys. Rad. 16.304(1955).

[7] Philibert, J., Proc. Third International Symposium, X-Ray Optics andj Microanalysis, Stanford, 1962, New York, Academic Press (1963) p. 379 '

[8] Duncumb, P. and Shields, P., in "The Electron Microprobe", Effect of Critical Excitation Potential on the Absorption Correction, New york, John Wiley, and Sons (1964) p. 284.

| [9] Poole, D. M. and Thomas, P. M., in "The Electron Microprobe", Correction Atomic Number Effects in Microprobe Analysis, New York, John Wiley and Sons (1964) p. 269. 1 [10] Derian, J. C, Determination experimentale du facteur de retrodiffusion eii microanalyse par emission X, Centre D'EtudesNucleaires de Saclay, CEA

Rept. R3052(1966). i
MULVEY 91

[11] Hailiday, J. S., Meeting on Quantitative Microprobe Analysis at the Institute of Physics (abstract only) (

1 962). [12] Wentzel,G.,Zeitschr. Phys. 40, 590 (1927).

[13] Lenz,F.,Zeitschr.Naturforsch. 99. 185 (1954).

[14] Bethe, H.. Annalen der Phys. 5, 325 (1930).

[15] Bethe, H., Handbuch der Physik 24, Berlin, Springer (1933) p. 273

[16] Duncumb, P. and da Casa, K., Institute of Physics Meeting. Recent Advances

in Electron Probe Microanalysis, London, 1967 (abstract only).

[17] Duncumb, P. and Melford, D. A., Quantitative Application of Ultra-Soft X-Ray Microanalysis in Metallurgical Problems, International Congress,

X-Ray Optics and X-Ray Microanalysis, Paris, September 1965.
1

ri
PROGRESS IN THE CORRECTION FOR THE

ATOMIC NUMBER EFFECT

D. M. POOLE

Metallurgy Division, Atomic Energy Research Establishment, Harwell, Didcot,

Berkshire, England

Abstract

The atomic number effect in electron-probe microanalysis results

in a non-linear relation between generated x-ray intensity and

composition; the paper describes those procedures for correcting

microanalysis data which take into account this effect and compares

their effectiveness by applying them to experimental data from

various laboratories. Four procedures are found to be the best; namely those of Thomas (1963) [1] and Duncumb (1967) [25] for

general use, and those of Belk (1964) [3] and of Ziebold (1964) [4]

for use when absorption effects are not large.

1. Introduction

I Mean atomic-number differences between alloy and standard in

j electron-probe microanalysis give rise to two factors which must be

taken into account when converting intensity ratios into

concentrations. These effects are (i) a non-linearity in the relation

between primary generated x-ray intensity and concentration, and

(ii) a difference in distribution of the generated x-rays between alloy

and standard which gives rise to a difference in the absorption effect even if the absorption coefficients in the two materials are identical. This paper is concerned with the attempts which have been made

over the years to deal with the first effect — i.e., the one which is by

usage entitled the "Atomic Number Effect". The evolution of

usable correction procedures will be traced, their principles

outlined, and their relative merits assessed as far as possible by their

application to experimental data obtained in various laboratories.

These data consist of two batches, the first of 150 analyses of alloys

of known composition and the second of an additional 79 analyses;

histograms have been prepared of errors resulting from the use of

various correction procedures on either the 150 cases, or, where

further evidence was required, on the full 229 cases. (See Appendix

93
94 ELECTRON PROBE

for notes on the method of applying the corrections and on the

preparation of the histograms.)

This discussion is restricted to work of a theoretical or practical | nature which has led to the statement of a procedure which the

practicing microanalyst can apply to his own data; it does not,

therefore, make any attempt to review related work not leading to a

' working correction method.

j

II. Discussions

A. THE ATOMIC NUMBER EFFECT

|

For simplicity in the discussions which follow, let us consider the

analysis of element A in a binary system AB , the analysis being with

[ reference to a pure standard of A; the data being obtained as the!

ratio, 1A/1(A), (or K), of the intensity of the characteristic x-ray!

emission from the alloy to that from the pure standard, A. More!

complex situations involving multi-component systems, compound i standards, etc., which arise in practice, can generally be dealt withi! by a simple extension of the binary method and are not discussed. I j The physical situation can be visualized by reference to Figure F|

where the behavior of electrons incident on the alloy and standard is- shown schematically; the alloy is supposed to be of a low mean'

atomic number (Z) and the standard of a high Z. A smaller fraction

of electrons are backscattered from the alloy leading to a relative enhancement of the x-ray intensity from the alloy; on the other

hand, the electrons lose energy more rapidly in the alloy, have less opportunity to produce ionizations, and thus generate a relatively

reduced x-ray intensity. The balance of these two factors is such,

that, in general, a low Z alloy referred to a high Z standard will have a generated intensity ratio less than the mass concentration of the analyzed element — i.e., the deceleration terms just predominate.

The generated x-rays will be distributed in depth (pz) somewhat

as shown by the function (f){pz) in Figure 1; as noted above, th^ integrated intensity under the alloy curve is not directly proportional

to concentration this being the atomic number effect as defined

previously. The problem is to derive some means by which this overall enhancement or reduction effect can be estimated to enable

the intensity ratios to be converted to concentration.

Furthermore, the distributions in alloy and standard are not of the same shape, thus giving rise to the atomic number contribution tc the absorption correction through the change in absorption path

lengths. I
(MEAN DEPTH)^„^y ^ (MEAN DEPTH

(AREA)^„^y <(^^E^Wdard

Z4>i,z) SHAPE]^,,^^ ^t<^(«^^SHAPE]^^^^^^^^

(ABSORPTION PATH)^,, 9^ ( ABSORPTION PATH)^^^^^

Figure 1. Schematic representation of electron backscatter, electron deceleration and distribution of x-ray generation in high and low atomic number targets.

1 In discussing the many attempts which have been made to correct

'or the atomic number effect, it is not possible to disregard the

related absorption corrections which are required, and in this
96 ELECTRON PROBE

respect there must be overlap between this paper and those dealing

with the absorption itself. Possible characteristic fluorescence effects, which can be quite

important, have been disregarded in the discussion and the analyses

used to test the methods are of systems where any such effects will be non-existent or negligible.

B. PROPOSED METHODS OF CORRECTION

The inter-relation between the many methods which have been

developed over the last 12 years can conveniently be described by

reference to the evolutionary plot given in Figure 2.

I MEASURE «(pi)ON WIDE |R«E0F_MEJALJS AUOYSj

MONTE CARLOORMODELl |AVERAGE ELECTRON ' |EMPIRICAL APPROACH

I CALCULATIONS OF BEHAVIOUR APPROACHES COMBINING AT No AND ABS ;

I ELECTRON BEHAVIOUR j i | [EFFECTS IN ONE PARAMETER

ARCHARD8MULVEY H62 AT No i ABS FACTORS

FOR A FEW SYSTEMS

CASTAING 1951, I960 ABS CURVES S EMPIRICAL, FOR AT No

[| PHILIBERT 1961

liv I CURVES WITH h ABS CORRECTION

THEISEN 8 TONC 196111! IM CURVES WITH !> FOB ABS 8 AT No

BIRKS 1963

l(,vl CURVES WITH p FOR ABS 8 AT No

THEISEN 1965 121 IM CURVES WITH h"8 R FOR ABS 8 AT No

2IEB0LOS OGILVIE 1964 READILY CALCULABLE

o PARAMETER

TRAILL 8 LACHANCE 1965 EMPIRICAL PARAMETER

FROM CALIBRATION OR

lOTHER METHODS

I

'—TmaKE APPRO

I 1 CONSTANT L

'

I B/,(i., OR „

''A.jl''*(^)^. dE

^ (*^)AI I

rRIGOROUS EVALUATIoli I

I 0Fii(E| 5ANOR

I

I

APPROXIMATION S LEADING TO TERMS I

BELK 1964 EXTREME SIMPLIFICATION FOR ABS 8 AT No

POOLE 8 THOMAS 1962 R EMPIRICAL

S FBOM NELMS

THOMAS 196] R FBOM THOMAS FROM 6ACKSCATTER DATA

S FBOM NELMS

SMITH 1966 R FROM GREEN

S EMPIRICAL

S FROM NELMS

DUNCUMB 1967 R FROM BISHOP

S FROM NELMS' DUNCUMB

] REED 1966 FULL DETAILS NOV

I AVAILABLE

Figure 2. Evolutionary plot of methods for correction of the atomic numbel

effect in electron probe microanalysis.

The overall objective of a correction procedure is to estimate the factor relating the intensity ratio to concentration, C-*,' in th« expression

I (pz) . exp - Xab d(pz) o

(f>A (pz) • exp -x^ pz d(pz)

(1

Superscripts refer to the element or radiation concerned (normally A and omittec

for clarity). Subscripts refer to the pure standard. A, or alloy, AB.
POOLE 97

This expression is exact and includes the two main corrections since

each d(pz) element of generation (through 0) is linked to the

appropriate absorption path (through x)- Three main routes can be proposed:

Firstly, (Route 1) measurements can be made by tracer experiments, of the type employed by Castaing (1960) [5], of the

function (/)(pz) for alloys and standards of interest so that equation

(1) could be evaluated. The amount of effort involved would be

impossibly large for general purposes and no such work has been

attempted. However, it might well be worth while carrying out an

examination of selected alloy systems as a direct check on some of

the estimation methods proposed.

Secondly, (Route 2) there is the estimation, by various means, of

the function </)(pz) and the associated absorption effect; this route

has been extensively used and can be regarded as having three subroutes— 2(i), 2(ii), and 2(iii) — covering calculations using models of

individual electron behavior, descriptions of an average electron

behavior by means of scattering parameters, etc., and empirical

approaches which combine the whole correction into a single

parameter.

Thirdly, (Route 3) there is the approach whereby the x-ray

intensity and distribution is considered as dependent on electron

backscatter and retardation terms and on the ionization cross

section (//(E); the absorption is evaluated separately. Using these

! concepts, there is then a choice as to the degree of precision with

I which the factors are evaluated— roughly speaking, two branches

have developed: 3(i) in which approximate solutions have been

sought and 3(ii) in which a more rigorous approach has been

adopted.

We may now consider these routes in turn and the procedures

which have been allocated to them.

Route 2(i). Estimation of (/)(pz) from a consideration of

individual electron behavior can be carried out in various ways. For

example, a large number of electrons can be followed through a large

number of interactions with the target material by a Monte Carlo

type calculation, or simplifications can be introduced to make the

calculation more manageable. An example of the latter approach is that of Archard and Mulvey (1962) [6] in which a relatively simple

model of the behavior of a selection of individual electrons was

used; the model is one which has already been shown (Archard
98 ELECTRON PROBE

(1961) [7]) to represent the backscatter process adequately. A, simple extension enabled x-ray yield and absorption effects of equation (1) to be calculated for selected metal and alloy targetsi

under various excitation conditions from which curves werq

obtained of the variation with composition of both the atomic;,

number and absorption effects in a few alloy systems. \ Strictly, the correction factor curves can only be used for thos^

systems to which they refer and the method cannot be generally

used as it stands unless the user is prepared to perform the calcu- lations for his own particular cases. However, an attempt has beer; made to approximate and interpolate between the published curves:

in order to perform some sort of correction to all 150 cases: (th^ error distribution diagram of the uncorrected data is shown in Figj ure 3) the resulting histogram is shown in Figure 4 but should noj

have much reliance placed upon it in view of the interpolation^^

employed to produce it. Figure 5, however, shows those easel' where little or no departure from the published curves was involvecjf

and considerable residual errors are still obvious here; in th^ absence of further calculations of the corrections for actual experi

mental situations, it is not possible to judge the method fairly. l' is to be hoped that the authors will find some means of carryinj

through these additional calculations.

Route 2(ii). This route contains those methods which hav(

evolved from consideration of the form of the 0(pz) distributioi* function; however, the curious point emerges that all the workabl

procedures involve the introduction of factors into the absorptioi

terms in order to correct for the atomic number effect, even thougl

the latter is really one of generation, i.e., the correction for (^(p^i

shape is being modified to attempt to correct for area differences. \\ The pioneer work of Castaing (1951) [8] and Castaing anj

Descamps (1955) [9], measuring </)(pz) and laying the theoretics' basis for further work, must be mentioned here although it did nc' lead directly to a usable procedure. In his thesis, Castaing (1951'

[8] introduced an empirical a term describing the properties of eaq

element such that the generated intensity ratio, K', was given by:

K' =(C'4a^/C^a^

This expression involving the assumpUon, among others, that

a:

<^,4(pz) d(pz)yj^ (/)b(Pz) d(pz)^ = (afj/a^) (3
POOLE 99

the various c^b here describing radiation A in pure A, or the same

radiation in effectively pure B. In his later publication, Castaing

(1960) [5] suggests that a is the product of two Z-dependent

factors: A., a coefficient describing the effect of backscatter, and a

deceleration term taken at that time as Z/A following Webster

(1928) [10]. Here, and in equation (2), we have the forerunner of

the methods later discussed under Route 3(i) and Castaing's work

might equally be mentioned under that heading.

Absorption terms, F(x) or f(x) according to assumptions made,^

can then be introduced such that the emitted intensity ratio, K, is related to the generated intensity by:

K = K'(F()^)^a/F(x:U) . (4)

Philibert (1961 on) [11] derived an expression for F(x) from an

electron distribution model which enabled the x-ray distribution

jfunction to be estimated in various target materials. His expression

I l/F(x) = (l + x/<7ni + h(l + x/CT)] (5)

(introduced the parameter h(=1.2 A/Z^) which enabled the function

lo be calculated for any pure metal target (cr is a Lenard coefficient

Idependent on incident voltage); by introducing an alloy h, calculated

irom the mean A/Z^ value for the alloy, the absorption function for

he alloy target could also be calculated. The parameter h takes into

Account the atomic number part of the absorption correction but

idoes not, however, constitute a correction for the atomic number

effect as such, although at the time this was not universally

|ippreciated.

About the same time, Theisen (1961) [12] and Tong (1961) [13]

jroduced expressions for F(x), exactly similar to those of Philibert,

vhich were claimed to perform the whole of the necessary

correction from intensity ratio to concentration when used in the

;quation

K = C(F(x)VF(x)^) (6)

he parameter h (called ^) in Theisen's expression was evaluated rom

h = 3.5A/Z2 (7)

jF(x) and f(x) are related by the the expression f(x) = F(x)/F(0) where F(0) refers to

i F(x) when x 0-
100 ELECTRON PROBE

The results quoted by Theisen in support of his expression were good but despite this the histogram for 150 cases (Fig. 6) shows

p

quite large errors. Heavy-in-light element combinations constitute

87% of the 1 50 cases and the atomic number effect, if uncorrected,

would bias the error distribution to the negative side; some evidencejl

of this bias remains in this histogram suggesting that the effect hasf not been fully compensated for. In his book, Birks(1963) [14] put forward a simplified method of absorption correction into which he introduced a factor p, dependent on Z, which was used to adjust the value of x before reading

F(x) from the tables provided; the F(x) values were then used in simple expression identical to equation (6). This procedure was

'*.

. . to make a correction for the variation of <^(pz)" and was

claimed to perform the atomic number correction. Using this method on the 150 cases produces the histogram in Figure 7 fron" which the errors are seen to be large and biased heavily to negative

values; the bias indicates that the atomic number effect is not being

corrected for. Two years later, Theisen (1965) [15] produced his book in which

his 1961 correction formula had been considerably modified to:

K = C(R^B/R^)(«X>^B/f(y)^) (8;

where R is an effective current factor (after Thomas (1963) [1]) tc allow for backscatter loss and f(x) is used (instead of F(x)) and is^ calculated from

l/f(x) = (1 + x/^e) [l + (^77) ^^""^ (9)

I where o-t is a modified Lenard coefficient taking into accoun

overvoltage:

o-E = (8.9 X 10V(V-Vc)2) (lo; and h now combined atomic number and voltage terms in th' expression

h = 1.72 X 10-«V2 A/Z^ (1

Application of the method to 40 of the available cases suggest

that the method is less satisfactory than the earli^ version — disregarding sign, the mean value of the apparent error i now 16% compared to 8% for the same cases treated by Theise'i
POOLE 101

12], and A% by the Thomas method. This is hardly surprising as

ve are introducing now only one of the two factors (backscatter

ind retardation) which to a large extent counterbalance each other

n theory and in practice. The result of this is that the reduction in ipparent concentration of heavy element analyses by the deceleraion effect is not corrected for and large negative errors appear in hese cases; similarly, analyses of the lighter elements of the binary

;ombinations show large positive errors. This bias in the sign of

he resulting errors can be seen from the following table:

Total no. Negative errors Positive errors

Heavy in light 26 25 1

Light in heavy 13 0 12

In view of the obvious inadequacies of this method, it has not

jteen thought worthwhile to apply it to the full 150 cases and no

histogram has therefore been prepared.

I Route 2(iii). Ziebold and Ogilvie ( 1 964) [ 1 6] proposed a method

ly which both the atomic number and the absorption effects were ombined into a single parameter, a. This was employed in the

elation (1-K)/K = a(l-C)/C (12)

[he derivation of the expression by which a may be readily

alculated has its origins in Route 3 — i.e., it takes into consideration

ackscatter and retardation terms — but its method of combining the

tomic number and absorption effects into a single parameter leads

» its discussion under the present head. The expression for a is:

a = 0.95 ( )/ -L

)The histogram of errors for the 150 cases is in Figure 8 and

lows a generally satisfactory distribution in view of accepted

icertainties in some of the data; virtually no skewness remains

id the atomic number effect would seem io be well accounted for. The method was further applied to the additional 79 cases and the

:|9-case histogram is given in Figure 13. A second method relying on a single parameter to combine both

kjor corrections is that of Traill and Lachance (1965) [17,18] who
102 ELECTRON PROBE

discuss the general area of spectrochemical analysis of multicomponent systems; they demonstrate that the expression

K = CV(1 +CBa^a) (14)

adequately represents observed intensity ratios in selected

analytical examples when uab is chosen to suit the particular system

investigated. The evaluation of a can either be by calibration or by a

combination of absorption, atomic number and fluorescence

corrections calculated by some such approach as those in Route 3

to this extent the method would not seem to have any great

advantage except perhaps for work involving a calibration

procedure. However, a special value may lie in the claim that! multi-component systems can readily be dealt with by deriving aj combined a parameter from the of's for the constituent binary

systems; this capability is also a feature of Ziebold and Ogilvie'

method.

The general similarity to Ziebold and Ogilvie's approach is suchi that the development of a separate histogram for this method was

not thought to be necessary.

Route 3(i). Methods which are considered as belonging to this route involve approximating to the initial intensity ratio by ar expression involving atomic number and absorption terms^ separately, viz:

|

RabJ </'^g(E)/S^B(E) dE (Absorption Factor)^B

K = C ^-

X

/*Ek

/ t/r^ (E)/S^ (E) dE (Absorption Factor)^

*^ E

Atomic number Absorption . (15

Here R is the effective current factor, already introduced, whicl

takes account of the loss of ionization due to backscatter, i//(E) is th ionization cross section for the radiation concerned and S(E) is th* stopping power of the target for electrons of energy E (definej as — (l/p)(dE/dx)). Approximations and empirical factors are the|

introduced to enable the atomic number part of expression 15 to b

evaluated. In their first method, Poole and Thomas (1962) [19] followed thj^ lead offered by Castaing's early work and by assuming that S w£: constant (and so placeable outside the integral) and that

/.A^y(E)//^^(E) = i (le
POOLE 103

they reduced equation (1 5) to the form

Ryiij Sa (Absorption function)^ h

K = C (17)

^AB (Absorption function)^

or K = C "-^ (18)

which is identical to the combination of Castaing's equations 2 and 4

and which assumes that

{SABlRAB)=aAB = C^aA+CBaH (19)

with SAlRA=aA and SB/R«=aK (20)

's was supposed equal to S from Nelms' tabulation [20J taken at

!30 kV, and R was taken from an empirical curve of the variation

iwith Z which had been estimated from the results of a few analyses.

At this stage the proposed correction for atomic number effect takes no account of excitation conditions.

This method was quite promising but a histogram is not given here

as it was soon succeeded by the revised method of Thomas (1963)

j[l] which takes account of the excitation conditions. In this version, equation (17) was still used but R was taken from curves

3f R versus Z and overvoltage (Eo/Ec) which had been estimated

Dy a rough approximation from published backscatter data; S

vas still obtained from Nelms' tables but was taken at E==(Eo+Ec)/2.

The procedure also involved a special way of attempting to allow

"or the atomic number part of the absorption correction — namely

he use of the same value of h(= h^) in Philibert's expression for

^(x) for both alloy and standard, coupled with a modification of

[AB to the form

Xab

Xks = -—^ (21)

C + C (a^/aA)

'his procedure has not been universally accepted as reasonable;

evertheless, the method works well as the histogram of 150 results Figure 9 shows.

Extension to the full 229 cases produces the histogram of

igure 14.
104 ELECTRON PROBE

o

cc

c

p

pE

p

p

p

p

e.L

1.z

z •i

zz

z.i

L

L

z

z >i

2.1

i1

2,Z_ i

2.

Z • ZIEBOLD t OGILVIE P - POOLE t THOMAS

C - CALAIS

K - KIRIANENKO

R - REED

0 • OUNCUMB

E p 3E

IP zlzlzli JIL

1-5 I I S o

9S 13S

POSITIVE PERCENT RELATIVE ERROR

Figure 3. Error Histogram — 150 cases, uncorrected data. Working from the voltage-independent atomic number correctioi

of the type proposed by Poole and Thomas, and from Philibert' absorption correction procedure, Belk (1964) [3] produced a gros

simplification enabling the complete correction to be reduced to

C = K

- ZAO

100 P + A

Atomic Number Absorption

where P = a sin 0 [(1 + h)/(l + 2h)] (23j

and if the atomic number Z of any component exceeds 40, it shoulc/
POOLE 105

Z • ZIEBOLO i OGILVIE

P • POOLE t THOMAS

C - CALAIS

K - KIRIANENKO

R - REED

H - HAWORTH

D - OUNCUMB

• HEAVY ELEMENT ANALYSIS

SI

p F pF

IS I IS 1

o

PERCENT RELATIVE ERROR

Figure 4. Error Histogram — 150 cases, Archard and Muivey method.

be represented by a Z' = 40+0.3 (Z — 40). The method will not work

well when the absorption correction is large and Belk has set limits outside which errors greater than 2% can be expected. Of the 150

cases, 1 28 are such as to be inside these limits and Belk has obtained

for these cases the histogram which is shown in Figure 10. Points

outside Belk's 2% limits have been added in distinguishing shading.

Despite its extreme simplicity, the method clearly works very well

and compares favorably with the more complicated methods.

Application of the method to all 229 cases gives the histogram of

Figure 15; again, points corresponding to cases which are outside

Belk's limits are marked.

Il'in and Loseva (1966) [21] have evolved an exactly similar

expression to equation (17). In this instance, however, R is set

,11 equal to (1— rj) where tj is the backscatter coefficient and S is

295-798 0-68—
106 ELECTRON PROBE

o

Z - ZICBOLO » OGILVIE P • POOLE t THOMAS

C • CALAIS

K • KIRIANENKO 0 - OUNCUNB [- HEAVY ELEMENT ANALYSIS

I

lO

ITS I3S 95 SS 15 IS 55 95 13-5 17-5 I >I8.5 O >"8S

j NEGATIVE 1 POSITIVE PERCENT RELATIVE ERRORS

| Figure 5. Error Histogram- 150 cases, Archard and Mulvey method, j selected cases. i

I

I again taken from Nelms' tables. Mean values of S and R are

| calculated separately for the alloy by weight fraction. The early''

work of Poole and Thomas has already shown that experimental \ observations indicate a value of ^ in the equation R = (l— ^tj)*

which is far from unity and hence, it seems certain that Il'in's * method will not give results of a good accuracy. On theoretical i| grounds, too, it is clear that the backscatter ionization loss (1 — R) I will not directly equal tj, as Il'in assumes, since many of the

backscattered electrons will already have contributed to the

The absorption factors are computed from a simple expression ij involving only the absorption coefficients of alloy and standard and ' the concept of a mean depth of emission — this depth is either I estimated from E and Eg or obtained by calibration. The method has ' not yet been applied to the test cases.
POOLE

o

107

Z - ZIEBOLD » OGILVIE P - POOLE t THOMAS

C - CALAIS

K - KIRIANENKO

R - REEO

H - HAWORTH

0 - OUNCUMB Q - HEAVY ELEMENT ANALYSIS

lOIZ

z.z. 1.z pF

z FF

IE

R

P

T7 z F

ss

PERCENT RELATIVE ERRORS

Figure 6. Error Histogram — 150 cases, Theisen method.

Smith (1965) [22] has also evolved a method for evaluating the terms S/R in the correction equation (17); he has utilized the more

rigorously determined R curves of Green (1963) [23] and an

empirical expression for S (based on one first proposed by Long)

namely

I S = [4.7+0.9 M(Eo-Ec)- In <Z>] <-4-> (24)

I A

j where <> denotes a mean value appropriate to alloy or standard.

I These terms are put forward for use with a set of mass absorption

j coefficients which have been specially derived to fit a large number

, of microanalysis results from mineralogical samples. The tabulation

of coefficients are not extensive enough to enable Smith's method to be rigidly applied to all our test cases; however, the departure of the
108 ELECTRON PROBE

o

P - POOLE 4 THOMAS

C - CALAIS

K - KIRIANENKO

R • REED

M . HAWORTH

O - OUNCUMB O - HEAVY ELEMENT ANALYSIS

20

PERCENT RELATIVE ERRORS

Figure 7. Error Histogram- 150 cases, Birks method. il

i| values from those given by Heinrich [24] are in general noti significant except for the soft radiations and Heinrich's values havej.; been used in evaluating Smith's method as shown in Figure 1 1 foiJ,j the 150 cases. \i Extension of the method to the 229 cases is shown in Figure 1 6. |

Route 3(ii). A more rigorous approach has been adopted by

Duncumb [2] who has carried through accurate evaluations of the expression / i/;(E)/S(E)dE and of the backscatter loss. By thh

means, he has been able to estimate the errors involved ir approximations and simplifications which have been proposed tc enable the correction to be simply carried out; for example, he ha^i shown that the assumption of S constant, which is implicit in all th( Route 3(i) methods, is one which in general introduces only a smal
POOLE 109

Z • ZIEBOLD t OGILVIE

P - POOLE t THOMAS

C - CALAIS

K - KIRIANENKO

R - REED

H - HAWOBTH

0 - OUNCUMB

- HEAVY ELEMENT ANALYSIS

30 -

20-

TP z i

p p

Yi T z 7'zrzrz

NEGATIVE

SS I IS 55

PERCENT RELATIVE ERRORS

95 135

POSITIVE

Figure 8. Error Histogram — 150 cases, Ziebold metliod.

error. As well as looking into the finer details, this work has also

produced a readily used method- Duncumb (1967) [25]. In this,

I the familiar S and R terms are employed in an equation identical to

( 1 7) ; R is taken from the curves recently produced by Bishop (1966)

[26J and S is evaluated from the expression

[, S=const. (Z7A)(l/E)In(1.166E/J) (25)

IS 1 where J is the mean ionization potential for the target material and is

m I evaluated from an empirical relation:

'"^'i J/Z = 15.05 [l-e-<'-"^2z]+(42/zz/io)-(Z/400) (26)

lie}:'. Equation (26) was evolved to give values of J which resulted in the

all ill best possible fit between corrected analytical results and known

Ijconcentration for selected alloys — i.e., microanalytical results have
110 ELECTRON PROBE

o

lO -

Z - ZIEBOLO » OCILVIE P - POOLE t THOMAS

C - CALAIS

K - KIRIANENKO

R - REED

M - HAWORTH

O - DUNCUMB

- HEAVY ELEMENT ANALYSIS

a

a

a

a

aan

aaan

aaa aaa

acina

aaats aana

aaaa aaaaa

aaaaaa aaaaaaaa aaaaaoaaaaa _ Qmaaaaaaaaaaaaa

nfMnanancifMfiaaiinfinnnnnnnnft

ITS O S 9 S S-5 I S

' I S >ies o

NEGATIVE T

ss 9-5 135 ITS>

POSITIVE PERCENT RELATIVE ERRORS

j

I Figure 9. Error Histogram- 150 cases, Thomas method. | been used to determine the apparent variation of the physicalf

parameter, J. The absorption correction is carried out usingl

Philibert's f(x) formula as modified by Duncumb to take account of

overvoltage.

[J Application of the method to the 150 cases produces th^'l histogram in Figure 12; in Figure 17, the extended histogram for the"^ 229 cases is shown. It is clear that the method is among the moresuccessful.

III. Conclusions

The general progress achieved by the various methods developecjj

from 1961 onwards can be assessed by reference to the histogram^

for the 150 cases in Figures 4-12; the differences in the success oj the various methods are emphasized by the tabulation (Table 1) o"
POOLE

o

111

Q

>I8 M- .KfP TP IE?

I - ZIEBOLO t OGILV(E

P • POOLE t THOMAS

C - CALAIS

K - KIRIANENKO

R - REEO

H - HAWORTH

D - OUNCUMB O - HEAVY ELEMENT ANALYSIS

fij - CASE OUTSIDE ACCEPTANCE

LIMITS

T7

I7S

>ia.s PERCENT RELATIVE ERRORS

Figure 10. Error Histogram - 1 50 cases, Belk method.

errors up to 10% are common, and only 27% of cases fall with

2 V2%. The first comprehensive method of Theisen (1961) [12] can be

seen to have achieved some measure of success in that the residual

errors do not show any of the bias which would arise from failure to

correct for a particular factor; however, the histogram is broad,

he percentage of cases for each method which fall with the limits ^2 1/2%. The basically more complex method of Archard and Mulvey [6]

I introduced in 1962 does not show any better results on the present

assessment with only 22% of cases falling within ±2 '/^%; in the

' 'jibsence of further evidence to the contrary, this cannot be regarded

* [^s a successful approach as far as general application is concerned.

In 1963, Birks [14] published his method which reduced the

orrection to very simple steps suitable for hand calculation. The
112 ELECTRON PROBE

o

Z - ZIEBOLO t OGILVIE

P - POOLE a THOMAS

C - CALAIS

K - KIRIANENKO

R - REEO

H - HAWORTH

O - OUNCUMB D - HEAVY ELEMENT ANALYSIS

30

95 135 POSITIVE PERCENT RELATIVE ERROR

Figure 1 1. Error Histogram - 150 cases, Smitii method.

histogram shows that the atomic number effect was not successfully

dealt with and the advantage of simplicity is outweighed by the large^ errors resulting; only 13% of analyses are corrected to within thdj 2 '/2% limits. |! The method of Thomas [ 1 ] was also published in 1963 and shows! a big step forward in effectiveness; the atomic number factors are; well corrected for and 55% of the cases fall within ±2 ViVo. Thej

procedure can be carried through by hand but can be readily

computerized if required. | The extremely simple method introduced by Belk [3] in 1964 cai^, be seen from the histogram to be remarkably successful; some of thet cases outside the prescribed absorption correction limits art reasonably accurate and even including all such cases in the coun- 42% of the results fall within ±2 '/2%. Where absorption effects ca^
POOLE 113

ZIEBOLO 4 OGILVIE POOLE I THOMAS

CALAIS KIRIANENKO REEO HAWORTH OUNCUMB

HEAVY ELEMENT ANALYSIS

iiij 135 95

NEGATIVE

ina

a

i3a

i3ai3 sa aaa

aaa

aaa aaa

aaa

aaa aaaa

aaeiaa

11

IS I IS O

PERCENT RELATIVE ERRORS

?1?TP1 fzTzl , tp^ IB , E

95 135

POSITIVE

Figure 12. Error Histogram - 150 cases, Duncumb method.

be kept small, by suitable choice of voltage for example, and where a

quick, easy correction is required then this is obviously a suitable

method.

Ziebold and Ogilvie's method [4] introduced in 1964 also

provides a simply used method which seems, however, to be slightly

less effective than Belk's with 37% of cases better than 2 ¥2%. The methods of Traill and Lachance [17,18] andofTheisen [15],

introduced in 1965, did not improve on the existing array of

procedures, nor did that of Il'in and Loseva [21] introduced in 1966. Duncumb [25] had been working on his method iot some time

before its nominal date of 1966 and it can be seen from the

histogram that it is very successful— some 53% of cases fall within

±2 '72%
114 ELECTRON PROBE

o

ZIEBOLD t OGILVIE POOLE t THOMAS

CALAIS KIRIANENKO REEO HAWORTH

OUNCUMB

CLAYTON COLBY

HEAVY ELEMENT ANALYSIS

£.c

cc

c

c

c

c

c

c

c

l_z

" f

J.L

L

l_

z. i

z

O

b I )51l )5f

'651 Ob c '6Vi

C I

' 'p i , . . .

: o

TSTz

..z

• rmi

13 5 9 5 NEGATIVE9 5 13 5 POSITIVE PERCENT RELATIVE ERRORS

Figure 13. Error Histogram — 229 cases, Ziebold method.

The method of Smith [22J though dated 1965 has had little publicity and only recently became widely known. The 150-case

histogram in Figure 11 is of a reasonable shape but shows a strong

bias towards negative errors which apparently arises from the

method of computing the atomic number correction. Figure 18

compares atomic-number-effect-only calibration curves for the

copper-gold system calculated by Smith's method and by the

Thomas method via a-values, from which it emerges that for both

copper and gold analyses the Smith method will give lower values of

the corrected concentration; it seems possible that there may be a change with composition from negative to positive errors in certain

systems. Thus, it appears that this method is a promising one but
POOLE

o

115

151

Oil

a\

HI aa

as

as

as,

1313 asi ass

laas aas

SBS

aas aaas aaas

isaas

inaias aiaaas

2 - ZIEBOLO t OGILVie P - POOLE t THOMAS

C - CALAIS

K • KIRIANENKO

R - REED

H > HAWORTH

O - OUNCUMB

A - CLAYTON O - COLBY Q - HEAVY ELEMENT ANALYSIS

PERCENT RELATIVE ERRORS

Figure 14. Error Histogram — 229 cases, Thomas method.

that in its present form is likely to give rise to a generally low

analytical result; of the 150 cases tested here only 30% fall within

the ±2 V2%. From the foregoing, it is clear that five methods Thomas, Belk,

Ziebold, Duncumb, and Smith are the most satisfactory and

between them offer either simplicity or accuracy or both. These

methods when applied to the 229 cases produced the histograms in Figures 13 to 17 from which emerges a similar pattern of success to

that apparent from the 150-case histograms — see also Table 1. The details of the results making up these histograms are given in Appendix II and examination of these and the histograms leads to the following comments.
116 ELECTRON PROBE

§

o • IfO tr

ZIEBOLD t OGILVIE POOLE t THOMAS

CALAIS

KIRIANENKO REED HAWORTH OUNCUMB

CLAYTON COLBY

HEAVY ELEMENT ANALYSIS CASE OUTSIDE ACCEPTANCE

LIMITS

O 35

^5

F5

55

'o i

135 9 S

NEGATIVE

_5L

5S 9S 135

POSITIVE

ITS

>IB'S

PERCENT RELATIVE ERRORS

Figure 15. Error Histogram -229 cases, Belk method.

Firstly, the methods of Belk and of Ziebold are quite good when

the absorption effects are not large; both methods fail badly on

the light element analyses in the data of Ziebold and Ogilvie (e.g., Ru-La in W) and of Calais (e.g., Al-Ka in Ni) especially when the

overvoltage is high and the effect of large absorption coefficients r most marked. Both methods deal well with results obtained through i a wide range of overvoltage when the absorption effects are small, as ii; shown by the measurements of U-L in UC, UN, etc., made by e Colby. Both methods are very simple and involve calculations : which are quick and easy to do by hand; on the present evidence \[ Belk's method seems slightly more successful. It should be

emphasized that neither method is satisfactory when absorption

effects are large and reference should be made to Belk's paper for the limits within which he recommends operating.
POOLE 117

55

56

65fi61 56^6

c5

R5

13 5 9 5 NEGATIVE

IF

A6g

EF

t F

Cl<5 EB

•EFFtF

FYF

E5

EE

zF

ZIEBOLO t OGILVIE POOLE t THOMAS

CALAIS KIRIANENKO REED HAWORTH DUNCUMB

CLAYTON COLBY

HEAVY ELEMENT

ANALYSIS

IFF

95 13 5 POSITIVE

zlEl

PERCENT RELATIVE ERROR

Figure 16. Error Histogram — 229 cases. Smith method.

Secondly, the methods of Thomas and Duncumb which are

basically similar, give results which are equally satisfactory. Both of

them deal tolerably well with the high absorption cases and with

results obtained over a wide range of overvohages. Bearing in mind

that there is considerable doubt over the accuracy of the basic data

in many cases it does not seem possible to draw any firm

conclusions as to the finer shades of merit between these two

methods either of which seems to provide a method of general

applicability; that of Thomas is a little simpler to carry out by hand

but both can readily be computerized.

Thirdly, it now emerges more strongly than before that the Smith

method leads to a tendency towards negative errors; the shape of the

histogram is quite good but it is centered on about -3% relative error and the percentage of results within ±2 '72% is only 29%. The
118 ELECTRON PROBE

o

i

2 - ZIEBOLO t OGILVIE

P - POOLE a THOMAS

C - CAL.AS

K - KIRIANENKO

R - REEO

H - HAWORTH

D - DUNCUMB

A » CLAYTON O - COLBY Q • HEAVY ELEMENT ANALYSIS

M\ Icl |zlzlzlz|clz

PFf

pFF

.A A C Ecz

135 9 5

NEGATIVE

95 I3S

POSITIVE PERCENT RELATIVE ERRORS

Figure 17. Error Histogram — 229 cases, Duncumb method.

appendix notes details of the variation between the absorption | coefficients used and those recommended by Smith and it is clear i that the overall negative bias in the corrected results does not arise i from this factor. ! The data employed in this assessment of the various methods

fulfill the conditions that the alloy composition should be

(supposedly) known, that characteristic fluorescence effects should

j be negligible, and that atomic number effects should be significant. I No other selection has been carried out and the data includes cases where the analyzed element is present in very small amounts, where

the "known" compositions may be unreliable, and where very large

' absorption corrections are involved; these factors no doubt

superimpose a considerable spread of errors on top of those arising
POOLE 119

i

i from the correction for the atomic number effect but it is clear that

the relative merits of the various procedures can be assessed by a

consideration of the overall error histograms. What can not be seen

j from this treatment, however, is the magnitude of the errors arising

I solely from the atomic number effect and it is clear that more

j reliable data are required before the various methods can be more

I closely compared or refined.

c

Figure 18. Comparison of Thomas and Smith atomic number correction curves

for the copper-gold system (adsorption and fluorescence neglected).
120 ELECTRON PROBE

Table 1 Method Percentage of results falling within

±2 1/2% error limits 150 cases 229 cases Archard and Mulvey *(22) -

Theisen[12] "(27) -

Theisen[15] "<27

Birks "(13) -

Ziebold and Ogilvie "37(44) 39

Thomas "55 (53) 61

Belk 42 47

Duncumb 53 55

Smith 30 29

"All 150 cases not computed -performance inferred from smaller sample ran^ domly selected.

" Figures in brackets were obtained when the data was processed by the dif

ference method (see appendix) using early values of absorption coefficients; thej remaining figures were obtained by the normalizing method using Heinrich's tab-| ulation of absorption coefficients.

IV. Acknowledgments

j The author wishes to thank most sincerely J. L. Shaw for hisj

patient and extended work in writing the computer programs for the

[ various methods; his contribution formed an essential part of thCj

preparation of this paper.

Note Added in Proof

i Heinrich has recently presented^ a discussion of the sources of j error in microprobe analysis. In particular, he examines in detail thej

data used in the present paper and suggests the exclusion of|

measurements which show inconsistencies, involve lowj

concentrations, or high absorption effects: when this is done the

error distribution is greatly improved and Heinrich concludes that the serious errors in the original distributions were due, not to the] failure of the atomic number correction, but to poor characterization!

of samples, high absorption corrections, and fluorescence effects which were not corrected for.

^"Common Sources of Error in Electron Probe Microanalysis", K. F. J. Heinrich. Advances in X-Ray Analysis, Vol. 11, Plenum Press, New York, 1967.1
POOLE 121

V. References

[1] Thomas (1963), B.J. Appl. Phys. 14, p. 397 and AERE- R4593.

[2] Duncumb (1964), 1st European Colloquium on Electron Probe Microanalysis.

[3] Belk (1964), Birmingham C.A.T. Tech. Note MET/26/1964.

[4] Ziebold and Ogilvie ( 1 963 ). Anal. Chem. 35. p. 62 1

[5] Castaing (I960), Advances in Electronics and Electron Physics 13, p. 3 17. [6] Archard and Mulvey (1962), Proc. 3rd International Symposium on X-Ray

Microanalysis; (1963), B. J. Appl. Phys. 14, p. 626.

[7] Archard (1961), J. Appl. Phys. 32, p. 1505.

[8] Castaing (1951), Thesis to University of Paris and WAL 142/59-7.

[9] Castaing and Descamps (1955), J. Phys. Radium 16, p. 304.

lOJ Webster (1931), Phys. Rev. 37, p. 115.

II] Philibert(1961),J. Inst. Metals 90, p. 241

12] Theisen (1961), Euratom Report — I-l. 13] Tong( 1961), unpublished work.

14] Birks (1963), Electron Probe Microanalysis, Interscience.

15] Theisen (1965), Quantitative Electron Microprobe Analysis, Springer-Verlag.

16] Ziebold and Ogilvie (1964), Anal. Chem. 36, p. 322.

17] Traill and Lachance (1965), Geological Survey of Canada Paper 64-57.

18] Traill and Lachance (1966), Canadian Spectroscopy 11, Nos. 2 and 3. 19] Poole and Thomas (1962), J. Inst. Metals 90. p. 241.

20] Nelms (1958), Supplement, NBS Circular 577.

21] Il'inand Loseva(1966), Industrial Laboratory 32, (5), p. 664.

22] Smith ( 1 965), J. of Geology, p. 830.

23] Green (1962), Proc. 3rd International Symposium on X-Ray Microanalysis, Stanford (Academic Press). 24] Heinrich (1964), The Electron Microprobe, Wiley and Sons, 1966, p. 296.

25] Duncumb (1967), private communication.

26] Bishop (1967), Institute of Physics Conference, London, Feb. 1967.

27] Poole and Thomas (1964), The Electron Microprobe, Wiley and Sons, 1966, p. 269 and AERE- R4796.

[28] Shaw (1967), Institute of Physics Conference, London, Feb. 1967 and AERER5597.

295-798 0-68—
122 ELECTRON PROBE

Appendix I. Execution of the Methods and Construction of the

Histograms

Two main variations are possible when the correction methods ! are being used which have an effect on the details of the results; | however, it has been estabUshed by appropriate comparisons that I these effects are only very minor ones and do not significantly | influence the overall picture of the value of the various methods, i These variations are: I (a) Choice of absorption coefficients. The tabulation by Heinrich

(1964) [24] has been preferred in this work but certain of the

| histograms are based on earlier values (see Poole and Thomas 1964) I [27]; the Thomas method has been carried through using both the [ early and Heinrich values and no great difference was observed. 1 (b) Treatment of binary alloys. Where only one component has

^ been measured the other has to be estimated by difference in order i to calculate alloy absorption coefficients and other parameters. L Where both components have been measured then each can be dealt with entirely separately, as in the former circumstance (the

difference approach; alternatively, best values for both components f can be normalized and used for estimating alloy absorption | coefficients etc. , at each stage of iterative procedures (the [ normalizing approach). Hand calculation using the difference

approach was employed on the methods of Archard and Mulvey,

Theisen and Birks; computer calculation' using the normalizing

^ approach was employed on the iterative methods of Thomas, Belk, :| Smith, and Duncumb; computer calculation was also used oni' Ziebold and Ogilvie although this does not involve estimating f" composition dependent parameters or iterations.

j Relative errors were calculated for each case by comparing the r corrected data to the "known" concentrations and used in the

j construction of the histograms; a low result is recorded as a negative j error.

I

\

' The computer programs were written by Shaw and were based on his universal microanalysis correction program (Shaw 1967) [28] which can deal with multi-l^ component systems.
POOLE 123

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I I I

fc §1 Q g

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I l + l + l I I 1^ + + +! I I IY77 + + +I +

w5rtooc^f~r--HcococoMOo^Oln*r^r-o^coooooc^^cM<^^

I I I + + + + + + I I777 + + + +I + + + I I I

+ + + + I I 1+ I I++I 171777?"^"'""'"' ' O

NI I I I I

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C - 6 3 >Z

0-

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3<

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o

03N

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(—If—(rtrti—<rt-Hrt«>— C^J CMCMCMCMCMCMCM oZ
124 ELECTRON PROBE

Percent

Relative

Errors

4N

Smith CM t~— lo o CO ^ ^ CM ^ ^ vo o 00 CO SO *^ r~— lo ^ o cc co uo oOvOCT^-— —"ON^'*cO'*rO'HCMrtcdu^coCMCT»'>dTfr~^OsO + 1 iY77 + + + + + + + + + + + +i777f"'"' '

'

Dun- cumb O^OO^iOOOO^OvOf-HOsCMOOOOLOiOOcOiOOOOsiOCMr^iOCM ^ — COTfcO—iOlO^IO'J'CMCMCMOvDtJ-COsO^CO'— vOCMOnJO—*,

+1 1 1 177++++++77+++17777++1 u

Thomas lou^"—'cor--T^.r— ^lO"—'coiot^oOi—'O00r~-foco^f0'—'O^ O

CMO^O'*CO(>J>di0^iOCMCMCM^r--^-^«iliCTsM'^I^O + 1 1 I + I7 + + + + + + 77 + + +I I777I +

I+I

Belk ****** ********

CM'*COOOCM-HvOCMir5vDvO'-'lO'*OOvOir300\OCOvOtO^|--;OOCM«J

Csio^CMr)''OlOvdr-;r-;cMCM^C-i>Osdr)-COCMOCO<joCMOfOodO^

1 , ^^^Y 1 + + + + + + ^ + + + + ^^^co^ 1,1-1

O

o8N 1 7 7 7 7

7 + + + + + + + 7 + + + + 7 7 7 7

7 1 177

9.88

10.20 2.84 3.00

Os \o 'i' CM

1 3! ov' vd 0' 1 t> — to CM CM CM <

633.8 174.6 160.6 633.8 593.7

Paired with No. l/3^Or^0C0^QI^000^Ol—'CMCO^or-000^0'-HCMCO'^'U5t--OOO^o' COCOeOCOeO^CMCMCMCOCOeOCO^'«j«^T5«LOTS'T}'^^T}'mi/5lOvO^

S = —icMt^or^t— oOTfiMinQOOTfirsmu^or-O'-ieM^outicouj toooa^^'0'—i^oooi—icocoo*ooo>Ti/^eM>or-voco^i—it^cMa>oa rfCgr-l-HOO•-lCM'3•m»OOOO^f-HTJ•^OCOO^l^5eM•-HOOr-'tCMl-^

•

• • • •

•

}

cosec

0

3.742

> 0 , . = J - [ 3 < ^O^OCOcOa^LOO^r^TfC^^r--'-HOOOOuOO^C^^C^^C^^U^.-HOO-HgQ^a

Ou^-^CO^O'—ieOTf'i/SvOCOa^'—iTf'sOCO<^COiOfOr-400N^OiO^

1

. 1

Radn. Ru-La Ta-La W-La Ru-La Rh-La

System A-B

Ru-Ta Ta-Ru W-Ru Ru-W Rh-W

Source

' — ' 1 0 1 =3= = = =

= =

= = = = = = = = ' = ' '1

1

No. OOO^O — CMC0'<S"irtvOt^000vOrHCMe0^m>Ot--000^O>—iCMeO^ CMCMcOfOcoeoeOcoeocOcOCO^ ^^^^^^^TrTj«ioi/5i/5LOifl^
POOLE 125

^OOCOO^^(MCC^COOOlJ^(M

r-.t— ovoo^OioO'j'ComcMincMco^cOLOCMO^OMirciNCMcowro^^^uo

ot^O'^Lna;MO^^a;CNioqcsirj-ootoeor~;Mco^'*cocc(N^*ow

I '^^ + + + +++ + I + + + + + I "^^ I + + I + + + + + I I + + + + +

+ + + +II++ +I+IIIIITI+++ ++++I+I++++

iOOvdcO^(No'c^'-H''-^ir3C-jO'*'-io'oOfCi--<^iOl>4'-!o

loo^dfOO^'ooco-Hc»5lr5cr^T}rtoooo^(^^o6ooooo'oc^

= = M 00 r-

^ r~ 1/5 Lo i~- r- CO c^j o r-<

1-^ 00 o lO O TO <rO ~ 5 =

irt CO

a> Lo cvj

vo

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O N tsi N N S < < <

H

Ol, m m \o ^ \o \o
126 ELECTRON PROBE

l-H CM CM CM CM CM CM CM CM CM CM CM CM CO Ll

Smith -1.9 +

0.8

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6.1 +

10.2 -4.7 +

0.8

-7.2

1

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CO

1 +

0.2

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0.5 1

o

fc u

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1

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1

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1

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-0.6 -0.4 +

0.7 +

0.9 +0.8

cent

Relat

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+ +

1.0 +

3.0

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0.3 +

1.1

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0.3 o -0.3 CM 1. 'f

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Belk

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0.3 +0.2

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2.3 +

5.8

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=8N

+

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0.8

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1

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0.7 +0.7 +0.7

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0.5 +

1.3 +1.3 +1.2

1-

CO

1

8.98 8.33

iCD

209.1 61.1 J

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1 < £^ 53.6 58.8 [

,71.5

Paired with No.

1 1 1 1 1 1 1

cc OS

r - oCO CO

CM

CO

OS00 U5

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lO COin

LO

lO

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lO in

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in

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3.699 3.621 3.415 3.621 3.592 c^

> 28.2 28.5 33.9 28.2 22.5 16.8 o lO oCM LO

CM oCO

in

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in

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< mCMo sCO olOo o

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CL

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iH

No. oON

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POOLE 127

CO CO CO CO •* CO CO CO CO CO CO "< —' CM

1

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' T 1

-13.2 -3.7 -4.9 -6.1 -8.0 -7.9 -7.8 -4.8 -1.4

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11.0 +

13.4 +

6.8 +

4.1

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+

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+

-0.6 -2.1 -4.3,-0.8 -0.8 -0.1 +

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0.8 o

+

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0.2

-5.8 +

0.5 CMd

+ o +

0.2 +

0.1 CO r- Tf* CO Tt LO vO O

1 X + + X

-3.7 -2.7 -2.0 CM CO 7 =

Os'

1

-10.4 -11.0

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12.1

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1 +

0.2

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2.9 +

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-6.1 -6.1 -4.9 -2.2 -0.3 -6.6 -4.1 -4.7 -2.9 -2.3 LO

1

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1.0 +1.6 +2.1 +

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o>

- 17.6

7.11 8.98 1.56

248.5 11.5 1.1 00

o^

CO

74.3 48.3 98.2

126.2 62.0

199.7 22.3 49.9

4838.6

110.0 94.3 71.5 53.6

385.5

lO

vO vO

00 OS orCM CO

r1 1 1 1 1 1 1 1 1 1 1 1 i 1 1 1 1 1 INIr1 vo Or~ o s CM

CO

t-^ o

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CO CO vD *so

CM sCCOCMCOOCOrt"*CO

r- ^ooiooi-~'*reioco

co= - = s t r^sOOsOssOTtsOiOOD CMCOCM—' — r~ c— zc lOCMCMOCOOs C'* r~ Os^LO-rtcOsO^ = - = r^O = ~ LO

a

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Reed

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CO OsOrtCsjco^'^iOOr-OOOsO'-'CMcO'+iOsOr^OOOsO—'CMCs"-t'OsCI^XOsO — <—'CMCMCMCsJCssJCMCMCMCMCMC0COC0C0C0C0CO'C0COCO-t-t-t'-t' + -+-^-Tt-rf-+i0IO
128 ELECTRON PROBE

CM CM CM CM CM CM CM CM CM CM CM

Smith

-16.0 -19.3 -16.8 -12.0 -6.5 +

7.7

-7.2

-17.1 -16.3 -9.4 +

0.7 +

5.2

-4.2 -6.3 00

1

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1

-3.9

111- -18.1 -23.8 -25.4 -22.5 VO -4.2

ive

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Dun- cumb 7

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1.0 +

15.6 601 +

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0.2 +5.6 +

11.7 +

9.7 +

9.0 +5.7 +6.6 d

1

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17.3 +

3.4 +

1.9

cent

Relat

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0.8 +5.1 +

15.1 +

4.6

-2.4 +

0.7 +8.5 +

17.8 +

8.4 +

2.1 +

1.3 +1.0 +

3.2 +5.4 +2.2

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oi

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3.2

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0.9

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1.0* +

2.5

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-16.2 -23.6 -29.7 -32.3 -31.2 -3.3

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u

1.56 2.08 1.56 = =

\

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= si"

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1

paired with No.

1/5 O o o

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POOLE 129

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130 ELECTRON PROBE

Percent

Relative

Errors

Smith —<0;vOC-^fOlM—'-HOOvO—'OOOi—'00^

1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1

Dun- cumb c^^c^ic^ic^i(^jc^ic^l<^jc^ie^ioooo

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»aN

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1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1

W 3.72

CQ

846.6

1004.0 620.7

<

620.7

Paired with No.

1 1 1 1 1 1 M 1 M 1 M 1 1

93 &i <

1) ii. birf S = cocococoooo3a5a^coooc^^^c^^^^^^^

cosec

0

1.261

> OiOOiOOl/50LOOl/50l/^OlOOu^ C-)(Mcr3CO-H,-HCM<NCOCO-HrtegMCO«3

3 < 00 CO ^

Radn. 02. s = = = = = = = » = = ' = = = = p

System A-B 3d D

Source Colby 1

No. CNlCMCVllMCMCgCgCMCMC^CMCMMCMCMCg
POOLE 131

Key:

* Case outside Belk's 2% accuracy absorption limits.

I Numbers in this column indicate the variation between the

absorption coefficients used in compiling the table of errors for

Smith's method and the coefficients recommended by Smith; the

code used is as follows:

No entry — coefficients the same

1 — either or both different from Smith's values by up to 2%

2 — either or both different from Smith's values by 2%-5%

3 — either or both different from Smith's values by 5%-10%

4 — either or both different from Smith's values by greater

than 10%

Prime — magnitude of coefficients very small

Kirianenko

THE CALCULATION OF STOPPING POWER AND

BACKSCATTER EFFECTS IN ELECTRON PROBE

MICROANALYSIS

P. DUNCUMB

Tube Investments Research Laboratories, Hinxton Hall, Cambridge, England

and

j

I S. J. B. REED

I Mineralogy Department, British Museum ( Natural History), Cromwell Road,

London, S.W.

Abstract

j The problem of calculating backscatter factors and stopping

I power for atomic number corrections in quantitative microprobe

i analysis is discussed. It is concluded that the stopping power S is

i best calculated from Bethe's formula, using values of the mean

ionization potential J determined empirically from analyses of

known compounds. A table of J values for practical calculations is given. Values of the backscatter factor R are also given, from

I calculations using Bishop's experimental measurements of electron

j backscattering coefficients and energy distributions. Simplifications

to the theory are discussed, together with methods of averaging S

and R for compounds. The accuracy and range of application of the

atomic number correction are considered, and areas where further

experimental work might lead to useful improvements are indicated.

I. Introduction

It was demonstrated by Castaing [1] that the relationship

between the mass concentration Ca of an element A in a specimen

analyzed in the microprobe, and the ratio k,4 of the intensity of the

characteristic x-ray line (usually Ka) from the specimen to that from

a standard consisting of the pure element A, is, to a first approximation, simply

kA = CA (1)

It is assumed that instrumental corrections, such as those for deadtime and background are carried out before calculating k,4, and that

the intensities from specimen and standard are measured under

133
134 ELECTRON PROBE

identical experimental conditions. Departures from the simple law

of proportionality expressed in equation (1) can be large, and if accurate quantitative analysis is to be attempted with the

microprobe, it is essential to apply a correction factor

k.4 = C4 X (correction factor) (2)

The correction factor is placed on the right hand side of the equation

because it is itself a function of C^, and of the concentrations of the

other elements present.

Following Castaing, most authors have divided the total correction factor into three separate factors: absorption,

fluorescence, and atomic number. Methods of calculating

correction factors for the absorption of the characteristic x-rays in emerging from the specimen, and for the additional intensity

contributed by fluorescence excited by other x-rays in the spectrum, were proposed by Castaing and have been developed further by I many authors. The third correction, the so-called "atomic number

j correction", takes into account the non-linearity in the relationship

between k.4 and Ca which remains after the other two corrections

have been applied. This might more appropriately be called the ' "generation correction" since it is governed by the relationship

between the intensity of characteristic x-rays generated in a specimen and its composition. The term atomic number correction

has come to be used because the properties of an element with 1 respect to x-ray generation are largely determined by its atomic I number.

In the microprobe, electrons accelerated to an energy in the range

5-40 keV are focused into a probe, usually of the order of l/xm, or

rather less in diameter, carrying a current generally between IQ-'^A

and 10-^A, which is made to strike the specimen at the point to be

analyzed. The incident electrons are subject to interactions with the

atoms in the specimen. These are broadly classified into elastic scattering in which there is a considerable change of direction, but

negligible loss of energy, and inelastic scattering characterized by

significant energy loss. Much of the high-angle elastic scattering is the result of interactions with atomic nuclei, whereas inelastic scattering is due to interactions with atomic electrons. The spatial

distribution of incident electrons in the specimen is largely governed

by elastic scattering, while inelastic scattering determines their deceleration and how far they travel before coming to rest. One form

of inelastic interaction is ionization of an inner electron shell, such
DUNCUMB AND REED 135

as the K or L shell, which is followed in a certain proportion of cases by the production of a K or L characteristic x-ray quantum.

However, an inner shell ionization is a relatively rare event, and the

: main contribution to the stopping of incident electrons is from large

! numbers of inelastic interactions with outer atomic electrons. Each

i electron suffers multiple scattering before either finally coming to

rest in the specimen or leaving the specimen altogether, as shown in

I Figure 1. The physical picture is thus one of considerable

! complexity, which makes the atomic number correction the most

I difficult of the three major corrections to reduce to a general and

1 reasonably simple form.

Figure 1 . Schematic representation of the volume irradiated by electrons incident on the target. Characteristic emission may be generated anywhere along the track of an electron, up to the point where its energy has fallen to the critical excitation

potential E/,. Some electrons are backscattered from the surface and cause

reduction in the mean ionization per electron.
136 ELECTRON PROBE

The ionization cross-section, Q, is defined as the probability per

unit path length of an electron with a given energy causing ionization

Qif a particular inner electron shell (K, L, or M) of an atom in the specimen. There is enough experimental information to establish

with reasonable accuracy the dependence of Q on electron energy,

E. It is therefore possible to calculate characteristic x-ray

intensities, given the number and energy distribution of electrons in the specimen. For this purpose it is necessary to have a model of the

physical situation which is amenable to mathematical treatment. All such models involve a degree of simplification which makes it essential to have experimental confirmation of results. The

relatively simple diffusion model of Archard [2] is not sufficiently

close to physical reality to be entirely reliable as a basis for calculating atomic number corrections. More sophisticated

calculations by Brown [3], based on a Boltzmann transport

equation adapted to electrons, give x-ray absorption factors which

agree quite well with experimental data, but fail to reproduce

accurately the observed energy distribution of backscattered

electrons. The most physically satisfactory approach is the use of

basic electron scattering data in a computer program which

synthesises electron trajectories by a Monte Carlo procedure.

Green [4] and Bishop [5] have used this method to compute

various quantities, such as electron backscattering factors and x-ray depth distributions, some of which can be measured experimentally.

The agreement with experiment obtained still falls short of that required for atomic number corrections, owing partly to inadequate

scattering data, but also because, even with the largest

contemporary computers, it is not possible to simulate physical

reality with sufficient accuracy. In any case it would not be

practicable to carry out a Monte Carlo calculation for every analysis

to be corrected. Even in the Monte Carlo method, it has proved

necessary to make use of a continuous mathematical function to represent the loss of energy by an electron as it travels through a specimen, whereas energy is in fact lost in discrete amounts, and the

energy lost by electrons travelling a given distance is variable.

Given a suitable equation for energy loss per unit distance

together with an expression for Q, the intensity of x-rays which ? would be generated if all the incident electrons stayed in the ? specimen can readily be calculated, independently of any model or other assumption. This procedure ignores the statistical nature of

energy loss by inelastic scattering, but this is equally true of the

models discussed above, which are chiefly of value for the
DUNCUMB AND REED 137

information they give about backscattering. There is in addition a

considerable amount of experimental data on electron

backscattering, and it is preferable in practice to make use of this rather than data obtained from theoretical models, although the

latter are useful, for instance, in suggesting how to deal with

backscattering from compounds.

The ability of a given material to slow down incident electrons is usually given in terms of stopping power S defined by

S = -(l/p)-(dE/dx) (3)

where p is the density of the material, x is distance measured along

the path, and the incremental energy change dE refers to the mean

change of energy in travelling a distance dx. Stopping power defined

in this way is approximately constant for a particular chemical

element regardless of its physical or chemical state. It follows from

the additive nature of energy losses that the stopping power for a compound specimen AB is given by

S^B = X,CiSi (4)

where C, is the mass concentration of the i"" element, the stopping

power of which is S,. The most suitable formula for stopping power is that given by

Bethe [6],

S = const. (Z/A)-(l/E) In (1.166E/J) (5)

where Z and A are respectively the atomic number and atomic

weight of the element concerned. The constant 1.166 is correct in

this case, rather than the value 2 often encountered in the literature,

which is appropriate when the incident particles are protons or other

positive ions, (Bethe and Ashkin [7]).

Bethe's formula was originally derived for the hydrogen atom, and

the extension to heavier atoms necessitated the introduction of the mean ionization potential, J, which must be expressed in the same

units as the electron energy E in equation (5). Bloch [8] deduced

from the Thomas-Fermi statistical model of the atom that J should

be directly proportional to Z making J/Z constant, with a value of

around 13.5 eV. Several experimental investigations have

confirmed that this is at least approximately true, though the

energies at which the experiments were carried out were generally

much higher than those encountered in the microprobe, and

agreement between different experimenters is not very good. Wilson

[9] obtained a value J/Z=l 1.5 eV for aluminium which has been

295-798 0-68— 10
138 ELECTRON PROBE

widely used in the literature, and may reasonably be substituted in equation (5), if it is to be assumed that J/Z is constant. For some

purposes this assumption does not lead to any significant error, but we conclude in a later section that it is necessary to use a somewhat

different relation between J and Z. From the definition of the ionization cross-section, Q, it follows

that the average number n of K ionizations per electron incident

with energy Eo is given by

n = (NopC^/A) f _5_ . dE (6)

-'E^ dE/dx

where No is Avogadro's number, C.4 is the mass concentration of

element A, and Ea is its critical K excitation potential. The same

formula applies to lines other than K, provided the appropriate Q

function and excitation potential are substituted. Making use of

equation (3), equation (6) becomes

n = (No-C,/A)/ (Q/S)dE (7)

The number n of K ionizations is directly proportional to the

intensity of the Ka line which is measured in the analysis, but in calculating this intensity, backscattering must be taken into account. This is achieved by introducing a factor R, which is equal to the ratio of the intensity actually generated to that which would be generated

if all the incident electrons stayed in the specimen, and is always less than unity. We thus arrive at a formula for the intensity of

characteristic x-rays generated

/"E

L=const. C^ R/ °(Q/S)dE (8)

II. Evaluation of the Backscatter Coefficient R

The backscatter coefficient R is related to the electron backscatter coefficient 17 which is the fraction of the incident electrons

which are backscattered. Figure 2 shows values of 7] measured by ' Bishop [lOJ for an electron beam of energy Eo = 20 keV incident

normally on the specimen. Similar results have been obtained by f other workers [11], and it is well established that tj is essentially a smoothly varying function of Z, and is almost independent of Eo, [ in the range with which we are concerned. If all backscattered elec- trons retained their original energy Eo, then 1-R would be equal to
DUNCUMB AND REED 139

0-6( I I I I I 1 r —t

Figure 2. Fraction of electrons bacicscattered (with incident beam normal to surface) as a function of target atomic number (Bishop [10]).

q. In fact they possess a range of energies, from Eo down, which

makes 1 -R less than 17 by an amount which depends on the energy

distribution of the backscattered electrons.

Webster [12] showed that R may be calculated from the energy

distribution of backscattered electrons, given expressions for Q and

S. Alternative methods of calculation proposed by Thomas [13] and

Tomlin [14] are not completely rigorous. Following Webster,

therefore, R is calculated from the formula
140 ELECTRON PROBE

1

where the new variable W is equal to E/Eo. The backscattered

electron energy distribution is represented by the differential di7/dW. Experimental curves of drj/dW for carbon, copper, silver,

and gold, due to Bishop [10], are shown in Figure 3(a). It is found

experimentally that, not only is rj insensitive to beam energy Eg, but

also the shape of the distribution expressed as a function of W is also

largely independent of Eo.

O Ol 02 0 3 0 4 0 5 0-6 07 0-8 0 9 lO w * ,1

Figure 3(a). Energy distribution of backscattered electrons (normal incidence), measured by Bishop [10], for carbon, copper, silver, and gold.

The backscattered electron energy distribution may alternatively

be expressed in integral form as t/CW), the number of backscattered

electrons with energy greater than WEo, which results in a rather

simpler formula for R
DUNCUMB AND REED 141

1 - R = — (10)

I R has been calculated from equation (10) using Bishop's data for

I i7(W) normalized to values of t) from Figure 2 and interpolated

j smoothly for elements between those for which the distribution was

experimentally determined (see Figure 3(b)). Equation (5) was used

for S, assuming J/Z-11.5 eV, with the formula for Q given by

Webster et al. [12]. Variation of J/Z within the limits of uncertainty

which exist for this quantity has a negligible effect on R. Similarly

the dependence of R on Eo arising from the variation of S with E is very slight and may be neglected, so that R may be expressed as a

function of Z and overvoltage ratio U = Eo/Ea only, as shown in

I Figure 4.

W «•

Figure 3(b). Integral form of energy distributions, with interpolated curves for aluminium, titanium, and piutonium.
142 ELECTRON PROBE

lO

09

07

—1

1 1 1 1

— E^E.

' hi

^N^^ 1-2

—

^vS. ^^^^

3 0

^V^\^^^ 60

^V^^ lOO

1 1 1 1 1 1 r aoi;

lO 20 30 40 so 60 70 80 90 lOO Z >

Figure 4. Fraction of ionization R remaining in target after loss due to backscatter, calculated from Bishop's data given in Figures 2 and 3(b).

The R curves in Figure 4 are fairly close to those obtained by

Green [15] using a similar method with earlier backscattering data

and agree well with some direct experimental measurements by

Derian [16]. The curves published by Thomas [17] are, however,

significantly different. The difference can be attributed firstly to the

inexact method of integration used by Thomas, secondly to electron

backscattering data of doubtful accuracy and thirdly to the fact that the lowest atomic number for which Thomas calculated R was 29,

the curves being extrapolated to R=l at Z-0 for all U. Figure 4

shows an inflexion in the curves in this region, implicit in the general

way the backscattered electron energy distribution varies with

atomic number. A linear extrapolation is therefore inaccurate, and

introduces significant errors in the area where the commonest

elements occur.
DUNCUMB AND REED 143

In carrying out the atomic number correction, the problem arises

of how to calculate R for compounds. Experimental measurements

of 7} show that the mass concentration average

ri = SAr/i (11)

gives quite accurate results for compounds. It is therefore

reasonable to assume that the same applies to R, so that for a compound AB

Rab = S,CiR, (12)

Theoretical calculations by Bishop [18] and Brown [3] are in

fairly good agreement with this assumption, although Bishop has

suggested that it may be preferable to average the shape of the

backscattered electron energy distribution independently of rj. This

is a question which requires further investigation; meanwhile it is reasonable to use equation (12) for practical calculations.

It is advantageous to express R as a function of 1/U rather than

U, which has been used previously; as noted by Bishop [18] the

variation of R for a given Z is nearly linear in 1/U, which greatly

facilitates interpolation. For practical calculations, it is convenient

to have R in tabular form. The R curves in Figure 4 have therefore

been converted into Table 1 , from which R can be obtained by linear

interpolation with respect to Z and 1/U, with an interpolation error of less than 0.2%. This table can readily be incorporated in a computer program for microprobe corrections.

Table 1. Values of backscatter coefficient R as a function of 1 /U

and Z.

0. 10. 20. 30. 40.

50.

60.

70.

80.

90.

99.

0.01 0.10 0.20 0,30 0.40 0.50 0.60 0.70 0.80 0.90 1.00

1.000 1.000 1.000 1.000 1.000 1.000 1.000 1.000 1.000 1.000 1.000 0.934 0.944 0.953 0.961 0.968 0.975 0.981 0.988 0.993 0.997 1.000 0.856 0.873 0.888 0.903 0.917 0.933 0.948 0.963 0.977 0.990 1.000 0.786 0.808 0.828 0.847 0.867 0.888 0.911 0.935 0.959 0.981 1.000 0.735 0.760 0.782 0.804 0.827 0.851 0.878 0.907 0.938 0.970 1.000 0.693 0.718 0.741 0.764 0.789 0.817 0.847 0.881 0.919 0.959 1.000 0.662 0.688 0.713 0.737 0.764 0.793 0.825 0.862 0.904 0.950 1.000 0.635 0.663 0.687 0.713 0.740 0.770 0.805 0.844 0.889 0.941 1.000

0.611 0.639 0.665 0.691 0.718 0.750 0.785 0.826 0.874 0.932 1.000 0.592 0.613 0.639 0.665 0.695 0.730 0.767 0.811 0.862 0.924 1.000 0.578 0.606 0.634 0.661 0.691 0.725 0.763 0.806 0.858 0.921 1.000

III. Evaluation of Stopping Power S

From equation (8), it follows that the ratio kA of the characteristic x-ray intensity from the specimen to that from the standard,

I neglecting, for the moment, absorption and fluorescence, is given by
144 ELECTRON PROBE

E

kA = Ca • • (13)

Ra /* e„

where suffixes AB and A refer respectively to the specimen and the

standard. Equation (13) can be simplified with very little loss of

accuracy by virtue of the fact that SaISab varies only slowly with E. This ratio can therefore be evaluated at an energy halfway between

E„ and Ea (17), and taken outside the integrals, which then cancel.

Thus equation (13) may be written

kA-CAiRABlRAHSjSAB) ^^"^^

where S is the mean stopping power obtained by substituting for E in equation (5), a value E given by

E = (1/2) (E„ + Ek) (15)!

The atomic number correction thus reduces to two separate factors, . one taking account of backscattering and the other of differences in mean stopping power between specimen and standard. It is not I necessary to use the full formula for S in equation (14), since the l/Ei

term cancels out. For practical correction calculations, 1/E may

therefore be dropped from equation (5). In order to check the error introduced by eliminating the integrals

in equation (13) in favor of the S approximation, the relative difference between the resulting correction factors has beenf

evaluated for a large number of extreme cases. Although it is not[

possible to state simply the conditions within which thef approximation is valid, the following points emerge: f a. The relative error is worst when analyzing a trace of one||

element in another, and in general increases with difference of

atomic number. I

j b. The relative error is worst at a U value of 1.5-2, presumably';

because the ionization cross-section Q is changing most rapidly in

this region. |i

c. At U=2, the relative error, defined as [k/C (integrated)-']

k/C(S)]/k/C (integrated), is negative for light elements in a heavy!

matrix, and positive for the reverse situation. To illustrate the magnitude of the error, we take trace amounts of: aluminium, copper and uranium in matrices of each of the other two

elements, making six systems in all. For CuKa and ULa, the error
DUNCUMB AND REED 145

is evaluated in the worst excitation condition of U=2, but since this corresponds to only 3 kV for Al Ka, a beam energy of 1 0 kV is used

in this case. The results are shown in Table 2. Even in these extreme

conditions the error is seen to be less than 1% in all systems except

forAl in U, where the severe absorption correction would in any

case prevent an analysis to this order of accuracy. For the Al-Cu

and Cu-Al systems the error is very small indeed. We conclude,

therefore, that in the vast majority of analyses involving elements in the atomic number range of about 1 3-92, the error introduced by use

of the S approximation is negligible. This also applies to the analysis

of the heavier component of most carbides and oxides, but not to the

lighter, where the absorption correction is in any case very high.-

Table 2. Error introduced in correction factor by using the S

approximation in a number of extreme cases.

Rel. error in System Excitation conditions correction factor

U La - Cu U=2 0.57 %

U La - Al U=2 0.86 %

Cu Ka - U U=2 -0.81 %

Cu Ka - Al U=2 0.38 %

Al Ka - U Eo = 10kV 2.31 %

Al Ka - Cu Eo = lOkV 0.04 %

Thomas [17], having suggested the S simplification described

above, introduced a further assumption first put forward by

Castaing, by which both parts of the atomic number correction are combined in the a coefficient. In this method, which is also used by

Ziebold and Ogilvie [19], equation ( 1 4) becomes

k/i = Ca (a^/SiC,a;) (16)

where a=S,7R,. This gives somewhat different results from separate

averaging of S and R (equations 4 and 12), which we have already

found to be the preferred method on theoretical grounds, and in many cases the error introduced is found to be as high as 1-4%.

Furthermore, in contrast with the S approximation, this error is worst for concentrations in the region of 50% which are often the ones that have to be determined with greatest accuracy. It would

seem, therefore, that the slight advantage of the a method in requiring only one averaging calculation is outweighed by the

significant error introduced.
146 ELECTRON PROBE

The only remaining aspect of the calculation of the atomic number

correction which requires consideration is the evaluation of J in the

formula for S. The available information about J is inadequate to supply exact numerical values, although experimental data suggest

that J/Z generally lies between 10 and 15 eV. It is therefore

necessary to use values of J determined empirically from

microprobe analysis of compounds of known composition. This

procedure has the advantage that the overall effect of small errors in other aspects of the atomic number correction is automatically

corrected, but is obviously dependent on the quality of the

microprobe data used.

For the empirical determination of J, we have used analyses by

several different laboratories of a number of known binary

compounds, collected by Poole and Thomas [13], to which have

been added some analyses by the present authors totalling 48 in all. Only cases in which the absorption and fluorescence corrections are

small (<2%) have been used, to ensure that errors in these other

corrections cannot influence the results. A consequence of this selection is that all the analyses used are of a heavy element in a light

matrix, but this should not affect the generality of the results.

Table 3. Alloys Used in the Determination of J u in Cu, Ni, Fe, Ti, Al, O, C

Au in Ag, Al

Zr in Si, Al, O

Ni in Al

Fe in Al, O

Range of concentration : 20 to 95% A in B

Range of kilovoltage : 10 to 35 kV

Total number of measurements : 48

The elements analyzed are shown in Table 3 and give a good j'j coverage of the periodic table from uranium to carbon. The curve of

J/Z against Z which gave the best overall resuhs for these analyses ;^

is shown in Figure 5, and was obtained in the following way. The i value of J for copper is probably the best known existing figure, andl'i

is given by (J/Z)c« = 13.0 eV. Starting with this value, a U-Cu alloygave an initial value for uranium, setting (J/Z)(/ = 13.7 eV to give the - best agreement between true concentration of uranium and the value ii calculated from experiment. Analyses of U-Al, U-Ti, U-Fe and U-

Ni alloys then gave points from which a curve from uranium to'l
DUNCUMB AND REED 147

16

11

10 10 20 30 40 50 60 70 80 90 100 Z

Figure 5. Mean ionization potential J plotted as J/Z against Z determined empirically from a series of microprobe analyses of known alloys.

I aluminium (Z = 13) could be constructed, taking into account

analyses of Fe-Al, Ni-Al, Zr-Al, Zr-Si, Au-Ag and Au-Al alloys.

Values of J/Z for carbon and oxygen calculated from analyses of U0, U-C, Zr-0 and Fe-0 compounds gave a sharp rise in J/Z at low

atomic numbers, but apart from this rise, the variation of J/Z with Z

j is rather slow. Although some scatter was evident where J/Z was

j determined from several analyses, this was generally less than

±0.25 eV. It therefore appears to be valid to assign a unique J value to each element at least in the range of accelerating voltages

covered (10-35 kV) and for the types of compound represented in

this set of data. No obvious physical reason can be advanced to explain this sudden rise in J/Z at low atomic number, which has also been

observed by Caldwell [20]. J/Z calculated in this manner is influenced to a certain extent by the R values used and the averaging

method employed but this does not account for the rise, as need for

it is found to be common to all methods. Neither is it explained by

the error due to fluorescence from the continuous spectrum, which

has been checked in a number of cases by the method due to Henoc

; [21].

i

] An analytical expression has been fitted to the J/Z curve in Figure

1 5 and this formula has been used to calculate J for all Z between 6

j and 92. These values are given in Table 4. The behavior of J/Z
148 ELECTRON PROBE

Table 4. Mean ionization potential J determined empirically as a j function of atomic number Z.

z J(eV) Z J(eV) Z J(eV) Z J(eV)i

D 14o ill JZ /uo 7S/ J

I 1 ni 7

-7/ I i J 3U IQ') 3yz ^ 1 J J 77n /zu / 0 1 ni 1

1U31|

Q0 IZ/ 3 1 Ann 4U / '\A j4 71/1 / 34 77/ / o

y 1Z3 3Z 4ZZ c c J J

7/17 78/ 0

11 n^7 uj /

1 n IZ3 33 /I T7 43 / jO 7/; 1 /o 1 7Qly 1 C\l 1

' 1 U / 1

1 1 1

IZO 1 /I 34 /I ^ 1 4j 1 J / 77^ / ID 80 1 084* i VO't

11 T 1 3 J 400 JO 788 / 00 810

11 nQ7 yjy 1

1 1

1

I/O 14Z 30 /I & 1 481 Jy oUZ oZ87 1till 1 1 1 ^

1 y1 14 1 j4 T73 / AQZ 47J OU 8 1 ^ 0 1

081J

1 1 74' 1 1 Z'fi

I J loo 3o J 1 U

A

0

87Q ozy 8AO't 11 117 1 J /

16 1 OA 1 oU 3y jZ4 OZ 8/11 o43 8"% 0J

1 1 ^ 1

1 1 J 1!

1 /

1 OA iy4 AC\ 4U j3o 03 0jo 8AoO 1 1 (\A

1 Q zuy /1

41 J 33 A/l 04 87M 0 /U 870 /

111// 1 77

1 0 ZZ4 4Z JO / 0J 881 00J 8800 1101 1

1 " i onZU 43 JO 1 00 8Q7 07 / 8Qoy 1 7043 Z

Zj J 44A A J 7 J 0 / Q1y i\)n 1 7 1 7l 22 270 45 609 68 923 91 123 It 23 286 46 623 69 937 92 124^

24 301 47 637 70 950 93 1257

25 316 48 651 71 964 94 127C

26 332 49 665 72 977

27 347 50 679 73 991

28 362 51 692 74 1004 [

1

1

S below carbon (Z = 6) is uncertain and the best procedure for lighter

elements is probably to assume J/Z is constant and equal to the value for carbon.

Using these values for J, the relative error in the correction factor,

defined as t

Relative error =
DUNCUMB AND REED 149

has been calculated for the 48 binary compounds. The results are

I presented in the form of a histogram in Figure 6(a). Of the 48 alloys,

24 show a relative error of better than ±0.5%, and all but 2 are

within ±2.5%. In Figure 6(b) the results are recalculated, setting

j J/Z=11.5 eV, as has been widely used in the past; the increased

I errors found in comparison with Figure 6(a) are readily apparent,

I only 6 analyses giving an error less than ±0.5%. Finally in Figure

j 6(c) the uncorrected values are plotted in a similar way, to

i emphasize the need for making the atomic number correction. Thus

j errors extending up to 22% are reduced by nearly an order of

I magnitude if the present procedure is followed. Taking into account

the undoubted existence of errors in the analyses, this is as good as

I can reasonably be expected, though as more and more accurate

results become available, it may be necessary to modify the J/Z

function still further.

IV. Accuracy of the Atomic Number Correction in Practice

It is important to know the accuracy of quantitative microprobe

' analysis. Reproducibility is governed by instrumental factors and x- ray counting statistics, whereas absolute accuracy depends on the

accuracy of the correction theory. Considering first the

backscattering factor in the atomic number correction, we see from

equation (10), that a given relative error in 17 gives rise to an equal

I relative error in 1 -R. Therefore there will be very little error in R for

1 elements of low atomic number for which R is fairly close to unity.

We estimate that R for elements with Z<30, which includes most of

the common elements, is accurate to ±1 %.

The position is less satisfactory for heavy elements, especially for

Z > 50 where both -q and the energy distribution of backscattered

electrons are appreciably dependent on Eg. For instance, Bishop

[10] found that 17 for uranium decreases from 0.534 at 30 keV to 0.495 at 5 keV, corresponding to a 5% increase in R. This variation

in R is further accentuated by the change in shape of the energy

distribution with Eo. The values of R in Table 1 were calculated for

20 keV, so appreciable errors may arise if different accelerating

voltages are used, particularly if they are below about 10 kV, when

the tabulated values of R may be several percent too low. It is desirable that in due course values of R for heavy elements, which

allow for the dependence on Eo, should be calculated, and this is an

I area which would benefit from further experimental investigations

of backscattering.
150 ELECTRON PROBE

FITTED J VALUES

^ >

-e -6 -4 -2 O 2 4 6 8

-22 -20 -18 -16 -14 -12 -lO -8 -6 -4 -2 O 2 4 6

Figure 6. Histograms showing relative error between measured and calculated^

intensity ratios for 48 known alloys (a) corrected using empirical J/Z function ofji Figure 5 (b) setting J/Z = 1 1.5 eV (c) with no atomic number correction at all.
DUNCUMB AND REED 151

The mass concentration averaging of R for compounds, expressed

in equation (12), may not be precisely correct, but theoretical

calculations (18) of R for compounds suggest that the error is not

much more than 1% in bad cases, and it will often be much less in practice. Experimental investigations of electron backscattering

from compounds would be most helpful in deciding whether a more

refined method of averaging would be more accurate. Furthermore,

if this and other aspects of backscattering could be studied with non- normal angles of incidence of the electron beam, it would make it possible to calculate values of R suitable for those instruments in which the probe is inclined to the perpendicular from the specimen

surface. Present indications are, however, that the effect of inclining the electron beam on the atomic number correction is small. According to equation (5), the stopping power becomes negative

when 1.166 E<J. This is entirely due to the mathematical form of

the equation, and is obviously not physically correct, but only

presents a problem for very light elements beyond the range of this discussion. Apart from this breakdown, there is a progressive failure of the Bethe formula as E approaches J, due to J being constant,

while in fact the effective value of J decreases with decreasing E. Livingston and Bethe [22] have shown how the formula may be

adapted to give the contributions to S of the K electrons and of all the other electron shells separately. In a heavy element the K

ionization potential is considerably higher than the highest

accelerating voltage used in microprobe analysis, so that the

contribution of the K electrons to S can be neglected. For E=15

keV, the Livingston-Bethe formula indicates that the true stopping

power of uranium is 1.4% higher than that given by equation (5), while if the estimated L-shell effect is taken into account, the

difference becomes about 3%. A similar calculation for copper

suggests a difference of about 2% in the same direction. K-shell

effects in light elements, for which E»Ek, are very small. Therefore

if the true mean ionization potential were used in equation (5) for the

atomic number correction, S would be underestimated by an amount

which increases with Z. However, the use of empirical values of J automatically tends to take account of K- and L-shell effects, and

will reduce errors due to this cause. The possible effect of the chemical state of the atoms in the

specimen has been neglected so far. Brandt [23] has calculated J for

free and bound atoms of various elements. Appreciable differences

I were found; for instance a value of 109 eV was obtained for

aluminium as free atoms, compared with 149 eV in the metallic
152 ELECTRON PROBE

I

I

i

State. The corresponding figures for iron were 211 eV and 241 eV.

j No doubt variations in J for a given element in different solid ; specimens are much less than this, but if Brandt's calculations are I correct, chemical differences may affect stopping power by up to | 2%. This makes it desirable for the analyzed element to be in a | similar chemical state in both standard and specimen, which also

' minimizes chemical wavelength shifts. I In the error histogram in Figure 6(a), 8 1 % of the analyses in which

the absorption correction is small lie within ±1.5% of the zero error

line, which gives some indication of the general accuracy of the

atomic number correction. However, the specimens vary widely in I the atomic numbers of the constituent elements and the size of the

j correction. In the range 12<Z<30, 10 keV<E„<30 keV, within

which a large proportion of practical cases lie, the atomic number

j correction factor is generally between 0.75 and 1.35, and ani

accuracy of 5% to 10% of the difference from unity is a realistic

| estimate. Thus an error of 3% of the concentration is possible in the j worst cases. It is obviously desirable to use as a standard something:

which approximates, even if only roughly, to the composition of the

specimen. If the correction factor is kept within the limits 0.90 to 1.10 the error in the corrected concentration should be less than,

±1%.

For heavy elements accuracy decreases, mainly due to increasing!

uncertainty in R. The error in the correction factor is least forj

accelerating voltages around 20 kV, but may rise to ±20% of the

difference from unity for the heaviest elements in combination with:

light elements, increasing still further as the voltage is lowered. It isl preferable to analyze such elements at not less than 20 kV, though'

this often resuhs in a large absorption correction, so that the overall

accuracy may in any case be limited.

j With regard to specimens containing elements less than 12 inj atomic number, the above procedure may be used for the analysisj

of the heavy component, but not of the light. Not only does the|

S approximation fail, but backscattering data are unreliable for the|

low voltages used for excitation of the light elements. In view of | the large absorption correction to be expected in this region, somcij

other procedure, such as the surface layer method reported byjj

Duncumb and Melford [24j, would be more appropriate.

|( So far the absorption and fluorescence corrections have been^j

ignored. It is outside the scope of this paper to describe how toil calculate them, but we will briefly consider their combination with > the atomic number correction. Some confusion has arisen in the past
DUNCUMB AND REED 153

in attempting to make the atomic number correction an implicit part

of the absorption correction. In principle this is possible as discussed by Duncumb and Shields [25] but in practice it is not

possible to represent the distribution of ionization with depth to

sufficient accuracy, to give a good measure of the total intensity

generated as a function of atomic number. For this reason, we

recommend that the atomic number correction, which, as noted

earlier, applies to the generation of x-rays, is treated as a separate

factor. The absorption correction is then merely a ratio of f(x) for the

specimen to that of the standard, where f(x) is the fractional

transmission of the target for x-rays which emerge in the direction of

the spectrometer. It is true that f(x) is dependent on atomic number,

but this is not to be confused with the "atomic number correction".

A method of calculating f( x), based on that of Philibert, has been put

forward by Duncumb and Shields [26]. The third part of the

correction, that for fluorescence, is simply the relative enhancement

of the measured intensity due to fluorescence, and may be

calculated by the method described by Reed [27].

Referring back to equation (2), ,we are thus able to calculate the

overall correction factor for any system of known composition. In

the practical case where the composition is not known, it is necessary to start with an assumed composition which is successively improved by an iterative procedure until the measured

intensity ratios are consistent with the calculated correction factors. This is carried out most easily with the aid of a computer, though

this is by no means essential. More important is the need to develop

a sound correction theory and establish its range of validity.

V. Conclusion

A practical method has been put forward for making the atomic

number correction in the analysis of elements of atomic number 12 and upwards. This is based upon Bishop's experimental data for calculating R values to allow for electron backscatter, and uses an

empirical relation between J/Z and Z for calculating stopping power.

Although more accurate analyses of known alloys may lead to a

modification of the J/Z function, the measurements used in the

present study were selected from those in which the atomic number

correction was dominant, and establish the general form of the

function with some certainty. The theory has been simplified as far as its fundamental limitations will permit, and is straightforward to apply with or without a computer.

295-798 0-68— 11
154 ELECTRON PROBE

VI. Acknowledgments

The authors gratefully acknowledge the assistance of Miss C. da

Casa and Mrs. P. K. Shields Mason in the work, and are indebted to the Chairman of Tube Investments for permission to publish this paper.

VII. References

Castaing, R., Thesis, University of Paris ( 195 1). Archard,G. D.J. Appl. Phys. 32, 1505 (1961). Brown, D. B., Thesis, M.I.T. (1965). Green, M.,Proc. Phys. Soc, 82, 204 (1963). Bishop, H. E.,Proc. Phys. Soc, 85, 855 (1965). Bethe.H. A., Ann. Phys. Lpz.,5, 325 (1930). Bethe, H. A. and Ashkin, J., "Experimental Nuclear Physics" Ed. Segre,John

Wiley and Sons, New York, (1953). Bloch, F.,Zeit. f. Phys., 81, 363 (1933). Wilson, R. R.,Phys. Rev., 60, 749 (1941). Bishop, H. E., "Optique des Rayons X et Microanalyse", Hermann, Paris, (1967). Weinryb, E. and Philibert, J., Comptes Rendus, 258, 4535 (1964). Webster, D. L., Clark, H. and Hansen, W. W., Phys. Rev., 37, 1 15 (1931). Thomas, P. M., A.E.R.E. Rept. No. 4593, Harwell, (1964). Tomlin,S. G., Austral. J. Phys., 17,452 (1964). Green, M., Thesis, Cambridge University, (1962). Derian.J. C.,CEA Rept. No. R3052 (1966). Thomas, P. M., Brit. J. Appl. Phys., 14, 397 (1963). Bishop, H.E., Thesis, Cambridge University, (1965). Ziebold, T. O. and Ogilvie, R. E. , Anal. Chem. , 35, 62 1 ( 1 964). ' Caldwell,D.O., Phys. Rev., 100, 291 (1955). Henoc, J.,C.N.E.T. Rept. No. 655 (1962). Livingston, H. S. and Bethe, H. A., Rev. Mod. Phys., 9, 245 (1937). Brandt, W., Phys. Rev., 104, 691 (1956). Duncumb, P. and Melford, D. A., Paper given at 1st National Symposium on

Electron Probe Microanalysis, Maryland, 1966. Duncumb, P. and Shields, P. K., Brit. J. Appl. Phys., 14,617(1963).

Duncumb, P. and Shields, P. K., "The Electron Microprobe", John Wiley and Sons, New York (1966) p. 284.

^ [27] Reed,S. J. B.,Brit.J. Appl. Phys., 16,913 (1965).
SCATTERING OF ELECTRONS IN METALLIC

TARGETS

GUNJI SHINODA, KENJI MURATA,

and RYUICHI SHIMIZU

Department ofApplied Physics, Osaka University, Higashinoda, Miyakojima,

Osaka, Japan

Summary

Monte Carlo calculations were performed to clarify the behavior

of electrons and to obtain depth distribution functions of

characteristic x-rays in copper and aluminum targets using Lewis'

multiple scattering theory and selecting the best fit values for the

screening factor. The results concerning backscattering and

penetration phenomena were obtained as a natural consequence of

the computation process. Agreement with experimental results,

both in the backscattering coefficient and the depth distribution

function, is sufficient for application to other materials and

problems.

The shape of the diffused x-ray source was also determined, and a comparison was made of the resolving power of x-ray and specimen

current methods.

I. Introduction

It is quite certain that an appropriate approach to clarify the

behavior of electrons in the specimen is to obtain an analytically

rigorous solution of the transport equation. However, to apply this to the problem of electron behavior, we must consider the effect of

backscattering; and it becomes very difficult to obtain such an

analytically rigorous solution. On the other hand, Monte Carlo

calculations would provide valuable information on the behavior of

electrons in the specimen target. Therefore, at present, Monte Carlo

calculation is the most appropriate approach to investigate the

behavior' of electrons in the target material, although the results of

j the calculation should be checked with the experimental results.

1 We have previously published the results of the determination of

the depth distribution function of x-rays in copper using three

different methods, i.e. (1) tracer method [l], (2) Monte Carlo

155
156 ELECTRON PROBE

calculation [2], and (3) analysis of angular distribution of

characteristic x-rays [3]. The agreement among the results obtained was quite good. Therefore, we propose that our Monte Carlo

calculation should also be applied to many problems other than

distribution functions.

Before performing this calculation, an appropriate simplified ' model should be chosen to describe the behavior of electrons. The

Archard diffusion model [4] is very simple and enables us to : understand various phenomena concerning electron penetration.

11. Discussion

A. THE ARCHARD DIFFUSION MODEL

Bethe et al. [5] defined the depth of complete diffusion as that in which (cos d)av, an expression of the mean deviation of electrons i from the initial direction becomes

<cos6>)a„=(l/e) (1) f

Archard further simplified this model, as shown in Figure 1 . ji

INCIDENT ELECTRONS I

Figure I . Archard diffusion model.
SHINODA, MURATA AND SHIMIZU 157

Electrons are assumed to penetrate into the specimen to a certain

depth keeping their original travel direction, and afterwards they

become completely diffused; their paths are indicated by the arrows shown in Figure 1 . The depth of penetration is such that the energy

has changed from Eo to Ed as defined by

/

dE 1 A ( dE/ds I 2

(2)

where s is the distance traveled and A is the mean free transport

path. From this formula, Archard obtained the depth of complete

diffusion Xd as

Xd = Xk (3) 7Z

where Z is the atomic number and x,{ is the range. Since the

backscattered electrons are included in a cone with half apex angle

6, the backscattering coefficient 17 is given by the following equation

2 L Xr - XdJ

(4)

The dependence of 17 upon Z can be obtain using Eq. (3), and it agrees with the experimental results fairly well. These equations are deduced frorn the small angle multiple scattering hypothesis of

Bethe et al. [5]. However, in the actual case, large-angle single

scatterings are also important, although they are not included in the

above treatment. As will be discussed later, the distribution

function obtained from this model does not fit well the

experimentally obtained values. Therefore, a better model should be

tried in a Monte Carlo calculation which should contain a

sufficiently high number of possible processes.

B. MONTE CARLO CALCULATION

When an electron of energy E strikes a target normal to the

surface at point Po (Fig. 2), the electron suffers a large number of

collisions with atoms and dissipates its energy through inelastic

collisions. Most electrons lose their energy in the target and are

detected as specimen current; some leave the surface and are called

backscattered electrons. In the Monte Carlo calculation, it is
158 ELECTRON PROBE

assumed that an electron travels a small distance AS,, in a straight line with constant energy Ei after having been scattered at the point Pi with a scattering angle (o>i, <f>i). Thus, if we take a simplified model of

the electron trajectory as shown in Figure 2, the behavior of the

electron in the target can be determined by the angular distribution

of scattered electrons, the energy loss, and the step length. The

outline of the calculation is as follows.

7 . Angular Distribution

It would be plausible to assume that the probability of deviation^^ about the azimuthal angle <f>i is uniform. However, for the zenithal'' angle w,, the solution of the transport equation by Lewis [6] for an

infinite medium has been utilized to describe the angular distributionj'

of electron scattering f(<«>) which is given for a certain path of an'' electron S as
SHINODA, MURATA AND SHIMIZU 159

f(^) = — (21 + 1) Pj(coS(o) exp (- / KjdS) (5)

4n

^

Jo

1=0

where

277 N / aid)) [l — Pj (coscij)J sinojdc

( 1 1 a'(1-a)Ma

= A ) 1 i / (6)

I 2i8(l + i6) 2 Jo (A-i8)^+' )

and P;(cos<«>) is the Legendre polynomial, /8 is the screening

parameter, o-(to) is the single scattering cross section, and

A=27rNZV/pV.

In the numerical calculation, the following approximation has

been used:

AS

KjdS = • AS

Then Eq. (5) becomes the same as that of Goudsmit and Saunderson

[7] for a thin layer or small AS.

The screened Rutherford type [8] expression has been used for

the single scattering cross section contained in the term Kjin Eq. (6); that is o-(a))=ZV/pV(l-cosw + 2/3)2 Here the factor for inelastic collisions has been neglected since the

probability that electrons are influenced by inelastic collision with

large angle scattering is small enough compared to that of elastic collision if the atomic number is not very low. In the case of light

elements, this effect is not negligible, and 7} in Eq. (7) should be

replaced by Z(Z+ 1) (Kulchetsky and Latyshev [9]).

The above angular distribution is accurate enough to describe real scattering phenomena of electrons in a given thin layer. However,

some considerations on the accuracy of the equation should be made
160 ELECTRON PROBE

by comparison with experimental results of electron scattering in thin films. Then an optimum value of the screening angle may be

found through comparison, since some discrepancies in the values of

j8 are reported (for example at 20 kV, as seen in Table 1). Table 1 . Values of screening parameter )8 for copper.

/S X 10^ Author

6.59 Moliere [10]

2.52 Nigam et al. [11]

2.01 Wentzel [8]

1.35 Cosslett and Thomas [12]

For each value of P in Table 1, the angular distribution f(w) was

calculated using Eq. (5). The calculated angular distributions were compared with experimental data for a copper film, obtained by

Cosslett and Thomas [12], and we have taken the value by Nigam i et al. [l l], as the best fitting value for copper at 20 kV. Before the

j actual calculation, the following considerations were made. I Since Eq. (5) is obtained from an assumption of multiple i scattering, too small a value of AS is not desirable. However, I experiments are usually made on thin films, and f(^ is obtained for ' values of thickness At. If At is sufficiently small we can take At i instead of AS. Therefore, the value of At that corresponds to the \ beginning of multiple scattering is taken. As in multiple scattering, if 1 f(^) is expressed by a Gaussian, then the log f(0)-^^ curve will be ji a straight line. After several trials, we have reached the conclusion ^. that multiple scattering should occur between At = 0.090 l^im and j, 0. 1403/u.m. However, it will be very close to the former.

If f{6) is expressed by a Gaussian, an estimate of the value of p i may be obtained from the value of f(0). Thus, for At = 0.090 l/xm, j j8 = 2.50 X 10-3, and for At = 0.1403/xm, /3= 3.66 x 10-3. Among,

the values shown in Table 1, the value 2.52 X lO-^ (Nigam et al. [11]) should be the best fit for copper at 20 kV. Then i;

2 ^ =1 /l.l2 A = Z^^V (0.885a„) (8);

4 \ P / «
SHINODA, MURATA AND SHIMIZU 161

where "R is the reduced Planck constant and ao is the Bohr hydrogen

radius. In Figure 3, a comparison is made with the experimental data of

Cosslett and Thomas [12] in which f(w) is normalized f(0) and

values of f(0) are shown as fJO) and f^iO), for experiment and

calculation, respectively.

The same consideration has been made for aluminum. The

Cosslett and Thomas result for 20 kV shows that multiple scattering

is found for pAt = 150 /Ag/cm^. From Eq. (5) /3 has been calculated

and fid) was also obtained. The thick curve of Figure 4 shows the

theoretically obtained result. Agreement between theory and

experiment is satisfactory.

2. Energy Loss

The energy loss of electrons in the target was calculated using the

relation given by Bethe [13]

-(dE/dS) =(27re4NZ/E) In (2E/J) (9)

where J is the mean excitation potential, Wilson's value [14] of

I J= 11.5 eV being taken. Then the energy of the electron at the

\ i-th step, Ei, is given by the following relation

E;=EM+(dE/dS) • AS,-.^ (10)

3. Step Length

\ The selection of the step length is constrained by two opposing

i factors. To estimate the real phenomenon of electron scattering more accurately, shorter step lengths are preferable in the Monte

Carlo method. But on the other hand, an appropriate step length is required to satisfy the treatment of multiple scattering and to obtain

mathematically a stable convergence of Eq. (5). In the present

calculation, this problem was resolved as follows.

The convergence of Eq. (5) depends on the exponential term in it, and the Kj-values converge to a certain value kj^^ as the value of I becomes large. Then as can be easily derived from Eq. (6), the

relation for is K,^^ AS = AAS/2|S(1

where A varies as l/E^ and ^ varies as 1/E. Since the condition l»/3

is satisfied if the step length is given for electrons of certain energy

Eiby

AS, = (E/E„) • AS„,
162 ELECTRON PROBE

fc(o) = 0.628 (AS = 0.1403fim)

fc(o) = 0.808 (AS = 0.12^m)

^e(o) = 0.786

CO (rad)

f^(o) = 1.25

fe(o) = 1.24

Figure 3. Comparison of calculated angular distribution with experiment for copper at 20 kV.

Theoretical, by Eq. (5) : /3 = 2.52 x lO-^. — — — Experimental, (Cosslett and Thomas).
SHINODA, MURATA AND SHIMIZU 163

d (rad)

Figure 4. Comparison of calculated angular distribution with experiment for aluminum at 20 kV.

Theoretical, by Eq. (5). • • • Experimental values of R. N. Thomas

(Thesis, Cambridge University, 1961).

the relation

ASi = k(ASo/Eo) (11)

is independent of E,. Thus, the above relation gives the lower limit of

step length for convergence of Eq. (5). Accordingly, the calculation

of electron scattering can be carried on with nearly equal precision

at each step; and moreover, the step length can be taken smaller at
164 ELECTRON PROBE

the region where dE/dS shows a greater gradient and vice versa. The

step length in the present calculation is, for example, 1.8x10-^ cm for copper at 30 kV, and 8.0x10"^ cm for aluminum at 35 kV)

4. Calculation Procedure

The calculation was carried out using an IBM 7074^ computer, for

accelerating voltages of 25.1, 30, 34.7 and 40 kV for copper, and

19.8, 25. 1 , 29.3 and 35 kV for aluminum. The numbers of steps and

trajectories are shown in Table 2. The statistical errors of

calculation for the values of the backscatter ratio are about ±0.01 at

all voltages.

Table 2. Numbers of steps and trajectories at various accelerating

voltages.

Copper

Accelerating Number Number of

voltage, kV of steps trajectories

25.1 20 2000

30.0 25 4000

34.7 30 2000

40.0 35 2000

Aluminum

Accelerating Number Number of

voltage, kV of steps trajectories

19.8 18 2000

25.1 22 2000

29.3 25 2000

35.0 29 2000

1 The authors appreciate the kindness of Nippon Kokan Co. Ltd.
SHINODA, MURATA AND SHIMIZU 165

C. RESULTS OF THE CALCULATIONS

1 . Backscattering ofElectrons

Examples of energy distributions of backscattered electrons are shown in Figure 5, and agreement with the experimental data of

Kulenkampff and Spyra [15] is satisfactory. These authors have

shown that the energy distribution is independent of the accelerating

voltage between 20 and 40 kV. This point was recently confirmed

by Burkhalter [16]. Our Monte Carlo calculation has given nearly

the same result, as shown in Table 3.

Table 3. Comparison of backscatter coefficients.

T/A/: calculated 7)e'- experimental

Copper

Accelerating Accelerating

voltage, kV -^m voltage. kV 17 £

25.1 0.347±0.013 10 0.339

30.0 0.331 ±0.009 15 0.31

34.7 0.330 ±0.009 30 0.319

40.0 0.330 ±0.009

Aluminum

Accelerating Accelerating

voltage, kV -q^ voltage, kV r/E

19.8 0.175 ±0.007 10 0.171

25.1 0.1 68 ±0.007 30 0.155

29.3 0.1 76 ±0.007

35.0 0.170±0.007

However, for 25.1 kV in copper, the discrepancy between

calculated and experimental backscatter ratios is somewhat large.

This may be due to the effect of the final step. In the present

i calculation, the backscattered electrons produced in each step are

i about 5% at 34.7 kV, 6% at 30 kV, and 1 1% at 25.1 kV. Since the
166 ELECTRON PROBE

dW

1.5

1.0

0.5 -

1.5

dW

1.0

0.5 -

Copper (30 kV)

ri = 0.331 ±0.01

Aluminum (35 kV)

7/ = 0.170 + 0.007

0.2 0.4 0.6 0.8 1.0

W = E/E„

W = E/E„

Figure 5. Energy distribution of backscattered electrons.

Full curve: Kulenkampff and Spyra. Histogram: present calculation.
SHINOJDA, MURATA AND SHIMIZU 167

energy in the final step is small, the Born approximation is no longer

valid; and consequently, the error increases with the increase of the

contribution of the final step.

2. Absorption ofElectrons

Absorption curves for electrons are shown in Figure 6 together

with experimental results. From these curves, the extrapolated

range R has been calculated as shown in Table 4.

Table 4. Extrapolated range.

Rx: by Monte Carlo calculation.

Rkp- by the experimental formula of Katz and Penfold [17]

Copper Aluminum

Accelerating

voltage, kV Ra-,/>im

Accelerating

voltage, kV R j,/i,m RKP,ixm

25.1

30.0

34.7

40.0

1.14

1.56

1.99

2.54

19.8

25.1

29.3

35.0

2.66

4.22

5.38

7.48

2.45

3.93

5.32

7.49

Agreement betvveen theory and experiment is good. For Rj. the

following experimental formulas have been obtained:

Copper: pRx=5.65xl02Eoi ^2 Aluminum: pR^=SJO\\O^Eo'-^'

in which

£«: initial energy of electron in MeV,

pRx: mg/cm2.

These values are close to those obtained by Glocker [18] and

those summarized by Birkoff [19].
168 ELECTRON PROBE
SHINODA, MURATA AND SHIMIZU 169

D. DEPTH OF COMPLETE DIFFUSION

The depth of complete diffusion, , is a very convenient quantity

for understanding the behavior of electrons in the specimen.

1 However, in the actual case, the transition from a straight path to a diffused path is not abrupt; and, consequently, it is not so easy to obtain experimentally an exact value of x^. For the physical significance of Xd,the following explanations are proposed by Cosslett and Thomas [12]:

j a. After many scattering events the absorption becomes

j exponential when a diffused state is approached. Therefore, the

I beginning of the exponential relation gives x^.

b. With the increase of penetration depth, the electron travel directions become divergent and, finally, the most probable angle of

distribution of scattering angles becomes constant. Such a state is that of complete diffusion.

c. In the state of complete diffusion, the probabilities of scattering

in forward and backward directions should be equal. However, this depth is not equal to the depth at which the number of forward

! traveling electrons has decreased to 1/2 the initial value, since due to

the effect of backscattered electrons, the number of electrons

traveling in the forward direction is smaller than half the number of

incident electrons; consequently the estimate of x^ from this standpoint will give too shallow values,

j On the other hand, the present Monte Carlo approach will give a

I clearer idea. Figure 7 is the result of calculations for copper and

aluminum. This figure shows the frequency of backscattered and

absorbed electrons and the maximum depth of their penetrations.

The right hand side corresponds to backscattered electrons and the

left hand side to absorbed electrons, x, is the range of electrons.

On Figure 7, we can observe the following points:

a. Backscattered electrons are mainly scattered near the surface,

and very few of them can penetrate beyond x^, the depth of

complete diffusion,

b. The highest frequency of maximum penetration depth of

absorbed electrons nearly coincides with x^. The maximum penetration depth of an electron is the depth at which the electron takes a path perpendicular, in the mean, to the

initial direction of incidence. This depth is the starting point of

random movement for that electron. The maximum frequency for

I

295-798 0-68— 12
170 ELECTRON PROBE

25 kV 30 kV 35 kV

0.10 0.06 0 0.05 0.10 0.10 0.05 0 0.05 0.10 0.10 0.05 0 0.06 0.10

COPPER

20 kV 25 kV 29 kV 35 kV 02 0 1 O 0.05 02 0.1 O 0.05 02 0.1 O 0.0502 0.1 O 005

0 —' ^

2,0. 40. X (//m) 6.0

8 0-

10.0-

12 0 ALUMINUM

Incident

Surface of specimen

Absorbed electron

Electrons

Back-scattered electron

X m

Figure 7. Distribution of maximum penetration depth for backscattered electron,,

(right hand side) and absorbed electrons (left hand side) for copper and aluminum

the absorbed electron should occur at x^, since electrons which have

traveled beyond this depth cannot escape through the surface. This

last point is to be expected from the Archard diffusion model. The

schematic explanations of the paths of backscattered and absorbec'

electrons are shown at the bottom of Figure 7.
SHINODA, MURATA AND SHIMIZU 171

The diffusion process in the target is illustrated in Figure 8, in which the depth distribution of electrons in each step is shown. Until

the ninth step, the original form of the distribution is preserved; from

there on, the change of wave form becomes more significant. This

process occurs at the depth and quite resembles a transition from

a shock wave to a sound wave or from a square wave to sine wave.

E. DEPTH DISTRIBUTION OF CHARACTERISTIC X-RAYS

One method to check the validity of the above calculation is to

calculate the depth distribution function of characteristic x-rays and

to compare it with the results obtained by other methods. If we

denote by N/c the number of Ka quanta and by m the total number of

ionizations of the K-shell, we have

= con^ (13)

where w is the fluorescence yield showing the decrease of the

number of Ko quanta due to the Auger effect and is a function of the

atomic number (Compton and Allison [20])-

Let us denote the K-shell ionization probability as Qa(E), the

Avogadro number as N/i, and the atomic weight as A; then dn^ , the

number of ionizations during the electron travel of length dx,

becomes

dn^ = (N^p/A) Q>^(E)dx

Therefore the total number of ionizations is given by

Hk = / dx = I Qk(E) dx . (14)

and n/f can be calculated if Q/f(E) and o) are known.

However, since the distribution function is only related to relative

values, i.e. the relative change of x-ray generation with depth, it is not necessary to know the absolute value of w. On the other hand, Qk(E) is a function of energy, for which Mott

and Massey [21] obtained the following formula using Bethe's nonrelativistic treatment: Qk(E)= (Ittc^IEk) . ( 1 /E) b (4E/B) (15)
172

1000 n

800 600

400

2000

ELECTRON PROBE

step no.

i = 1 i = 2 i = 3 i = 4

4CC 200i = 7 i = 8

400' 2C0

0

200

200

0

i = 10 i = 11 i = 12

i = 13 i = 14

i = 18

10 20

i = 20

i = 15 i = 16

layer

10 20 10 20

i = 25

10 20

0 1.0 2.0 0 1.0 2.0 0 1.0 2.0 0 1.0 2.0

depth(/im)

^

I

Figure 8. Diffusion process in the target. Frequency as a function of depth -ij = number of steps. Horizontal scaler: Number of layers (upper scale), and depth in /xm (lower scale).!

I

if we accept for b and B, Worthington and Tomlin's [22] values,

[

b=0.35 and B=[l.65+2.35 exp (1-U)] • Ek,

we have

1 4U

0

Qk (E) -E^ = 0 .7 776^— In 1.65 + 2-35 exp (1-U)

(16j

where Ea^ is the excitation energy of the K-shell and U= E/E/f.

Figure 9 shows a comparison of the theoretical and experimental

values, (Pockman et al. [23]), for nickel together with corrected;

values considering relativistic effects (Perlman [24]). For nickel,!

since E=80 keV for U = 10, the effect of the relativistic correction isj
SHINODA, MURATA AND SHIMIZU 173

X 10-

Figure 9. Ionization cross section of K-shell for nickel. A. Relativistic theory of Perlman.

B. Non-relativistic theory of Worthington and Tomlin.

0 = experimental result of Pockman et al.

i

no longer negligible; therefore, in the case of copper, the

experimental value of Pockman et al. [23] has been used in the

following relation

[Q/f(E) • Ea^]c„=[Qa(E) • Ea^]m (17)

However, in aluminum, even for U= 20, E=30 keV and, therefore,

( a non-relativistic treatment has been adopted.

The depth distributions are summarized for total electrons,

dividing the target into layers of 0.05/Am for copper and OASAS/xm

for aluminum. Results for copper are shown in Figures 10 and 1 1. To compare these results with those of Castaing and Descamps

[25] for 29 kV, it should be normalized by

[ / <^A/(pZ)dpz]g=gfcel- [(E-EK)^''']E=EkeV

g

i [ j Z)dpz]29 key [(E-E/fV-^]29A:ef
174 ELECTRON PROBE

0.5 -

Figure 10. A comparison of the calculated depth distribution of CuK radiatioi with the results of the other two methods.

|

I Monte Carlo calculation (30 kV, y = 90°). ' Tracer method (28.5 kV, 7 = 80°). i Analysis of angular distribution (30 kV, y = 90°). [ Castaing and Deschamps (29 kV, y=80°). I y= incident angle.

|

i

i

I
SHINODA, MURATA AND SHIMIZU 175

0.5 23.8 kV\

-30.0 kV 33.1 kV \

\25.1 kV \ \ \^

\ \ \ \ \ 31.7 kvV

\ \ \ \ \ \ \N

V 28.5 kV V 26.5 kV'\^^

0.5 1.0

,2^

1.5

Figure

pz (mg/cm^)

1 1 . Depth distribution of CuKa radiation at various accelerating voltages.

ARL-EPMA, take-off angle : 52.5°. JXA-3 XMA, take-off angle : 15°. Monte Carlo method.
176 ELECTRON PROBE

where (f^ripz) and 4>m(pz) are those obtained by Castaing and

Descamps, and by the present Monte Carlo calculation,|( respectively. jj Figure 12 shows the depth of maximum x-ray generation in copper and aluminum. The variation of this depth depends on thej

accelerating voltages, and the maximum nearly coincides with thej

depth at which electron absorption just begins. This means that in x-i, ray generation, the role of inelastic scattering of electrons near the

surface is very important. Following the Archard diffusion modelj

the maximum depth of x-ray generation, x,„, should coincide with

Xd. The distribution function derived from the Archard model show^

better agreement with experiment than that from a straight lin^ course model. But even for the Archard model, the value of th{

peak is too deep.

1

V (kV)

I

Figure 12. Depth of maximum x-ray generation x„, and complete diffusion x

pz = depth, V = accelerating voltage; I O = copper and x = aluminum.
SHINODA, MURATA AND SHIMIZU 177

Figure 13, shows the distribution function for aluminum obtained

by the Monte Carlo calculation, and in Figure 14 results obtained by

analysis of the angular distribution are shown together with that of

the tracer method of Henoc [26] for comparison. Compared with

the other two methods, the Monte Carlo calculation gives less

significant x-ray generation in a deep layer. However, as the range

of electrons at 30 keV is 2. 1 mg/cm^, generation of x-rays in a range

deeper than this depth should not be considered primary excitation.

•igure 13. Depth distribution of AlKa-radiation at various accelerating voltages.
178 ELECTRON PROBE

Analysis of angular distribution, (30 kV). Tracer method (Henoc), (29 kV). Monte Carlo calculation, (29.3 kV).

/Lt/p= 385.7

(Li/p = 459

In the tracer method of Henoc, where magnesium is used as

tracer, excitation of Mg Ka by Al radiation would be plausible. Also,

in the angular distribution analysis of characteristic rays, excitation|t

due to continuous and characteristic x-rays from heavier impurityj:

elements would be conceivable. Therefore, one should recall thati our Monte Carlo calculation will give the distribution function for primary x-ray generation, while the angular distribution analysisjii

gives that for actual analyzing conditions in the electron probelf

microanalyzer. However, the difference is mainly in the lowei^r intensity region and, therefore, either value will be usable for the,

actual correction.
SHINODA, MURATA AND SHIMIZU 179

In the numerical computation of corrections, the f(x)-function, as ihown in Figure 15, is usually used. The present Monte Carlo

:alculation gives somewhat larger f(x) values; however, the

lifference is not very significant. Green's results [27] are also

(hown, marked by circles.

1

1 In the analysis of the angular distribution of characteristic x-rays,

jixact values of absorption coefficients are indispensable. In Figure

I [4, two results for different absorption coefficients, one an

|;xperimental value of Andrews [28] , the other a computed value of

lieinrich [29], are shown. The higher value gives a better result.

Ilecently, a new value has been reported by Bucklow [30], Metals

kesearch Limited; this value is between the previous two (/a/p=408

jim^gm '). It gives better agreement with those obtained by other

inethods, especially in the high intensity region.

F. SHAPE AND SIZE OF THE X-RAY SOURCE

To determine the size of the x-ray source, it is important to obtain

ftn exact idea of the resolving power of the electron probe

imicroanalyzer. Ehrenberg and King [31] investigated the electron

'HI. (iiffusion in targets using fluorescent materials. However, this does

lot coincide with the diffused x-ray source, because primary x-ray

;ources should be smaller than the electron diffusion zone. On the

pther hand, for an element with high atomic number, the fluorescent

k-radiation excited by the continuum is significant; and

fonsequently, the x-ray source will broaden and become larger than

he electron diffusion zone. In our laboratory, the size and shape of

he x-ray source was determined in copper using the following

nethods:

I a. from a relation between x-ray intensity and knife edge disi jlacemenf — source broadening,

| L b. from the Monte Carlo calculation — source depth, and

I c. from the depth distribution — source shape.

Iji The source broadening determined by Shimizu and Shinoda [32]

^ s based on the following assumptions:

>

' a. the intensity distribution of an electron beam is of the Gaussian

'i'type. I

b. the functional representation of a wedge-shaped specimen

' traversing the path of the electron beam is expressed by a stepfunction, and
180 ELECTRON PROBE

iOOO 2000

1.0-

0.8 Hx)

OS

0.4-

0.2

(a) COPPER — cosec^)

lObo 2000 3000 4000 9000 0000 7000 6000

10 kV

- 20 kV

20 kV

29.3 k\/, 29 kV

30 kV

1

(b) ALUMINUM X (= — cosec 6)

Figure 15. Relation between f(x) and x( = /a/p cosec 0). (a) Copper, from angular distribution,

(b) Aluminum, from comparison of various methods.

Angular distribution of x-ray. Monte Carlo calculation. Tracer method (H6noc, 1966).

o Green (9.8, 20.5, 29 kV).
I

SHINODA, MURATA AND SHIMIZU 181

c. the intensity distribution of x-rays in a lateral direction for an

jclectron beam with infinitesimal cross section is given by a

Gaussian.

The excitation by the continuum is neglected, because it is less !than 10%. The result is as shown in Figure 16.

ACCELERATING VOLTAGE(kV)

i Figure 16. Variation of size of the diffused x-ray source for copper with accel-

! crating voltage, the electron beam diameter being I/Ltm.

If the intensity distribution in the direction of depth is also

expressed by a Gaussian^, the shape of the x-ray source is given by

Wittry [3 3].

F(x,y,z)=F(z) •F(x,y)=A exp-a (z-Zo)2 exp-b (x^+y^) (19)

Therefore, the integration of F(x,y,z) with respect to x and y gives

the distribution function F(z), and for z=0, it becomes (/)(0). Thus,

^The same assumption has been successfully applied in the case of analysis of the

angular distribution of x-rays.

! 'Wittry's formula, slightly modified.
182 ELECTRON PROBE

we have

[F(z)].=o = [/ F(x,y,z)dxdy],=o = <^m

and

^ _ b0(O)

(20

Figure 17 shows the shape of the diffused x-ray source, contours

of which are given by the following logarithmic scale, taking y- 0

log F(x,y,z)=log A-[a(z-Zo)2+bx2] log e (21

The right hand side shows intensity contours while the left banc

side is plotted for each accelerating voltage and gives contours for

j F(x,0,z) =. (1/e) [Maximum value of F(x,0,z)] (22!

For all practical purposes, x-ray microanalysis is done of thj

volume bounded by the contour of the left hand side of Figure 17 Table 5 shows these volumes for copper.

Table 5. Volume microanalyzed.

Accelerating voltage Volume analyzed

kV (/Am)3

20 1.38 25 2.97

30 5.56

1

Therefore, if the accelerating voltage is reduced 20% from 30 kV

the volume used for microanalysis is reduced by half, and we wi

obtain information from a much smaller volume.

G. RESOLVING POWER IN SPECIMEN CURRENT ANALYSIS

As already shown, the maximum depth of backscattered electron? does not exceed x^; and the rate of backscattering is determinef

by the mean atomic number of the material between the surfad

and Xd. Therefore, we have (specimen current) = (incident bea^

current) — (backscattered electron current).

However, the effect of secondary electron emission is not cor tained in the above expression.
SHINODA, MURATA AND SHIMIZU 183

2 X

! 30 kV

•igure 1 7. Shape of the x-ray source for copper. Upper: intensity distribution of the electron beam.

Lower: intensity contours, left: for 1/e of maximum intensity; right: of

x-ray intensity for 30 kV on a logarithmic scale.

i The resolving power of the specimen current method should be

> etermined by the behavior of electrons between the surface and the

I epth Xrf. Figure 18 shows fractions of electron backscattering and

I -ray generation as a function of specimen thickness. The depths for

\0% are 0.92/xm for x-rays and 0.61^tm for backscattered elecj ons. If electron scattering occurs according to Archard's model

!nd the shape of the x-ray source is as shown in Figure 17, the

I olume analysed by x-rays is about five times that of backscattered

k lectrons.

[) Practically, this ratio will be much larger because if the theory

)f Bethe et al. [5] is valid to the depth Xd, the mean deviation 6

(fom the initial direction is given by

<cos ^)ai;=(l/e).

'I

I
184 ELECTRON PROBE

0 0.5 r.o f.5 2.0 j z(/xm)

I

j

Figure 18. Fractional backscattering of electrons tjb and emission of x-rays foJ copper.

X-ray (30 kV). o (Cosslett and Thomas, 1965).

This means that at a depth close to x^, the deviation reaches this* level; and, therefore, until certain depths, no appreciable deviatiorii of electron travel direction should occur. Hence, the volume'}

analysed by the backscattered electron or absorbed electrori methods should not exceed signficantly the volume determined byj

the beam cross section times x^. This volume should be much

smaller than that calculated from Archard's model. !j

This paper is based mainly on the Thesis (Osaka University,

1967) by K. Murata, one of the authors.
SHINODA, MURATA AND SHIMIZU 185

III. References

Shimizu, R., Kishimoto, H., Shirai, T., Murata, K., Shinoda, G., and Miura,

M., Technol. Repts., Osaka Univ. 16, 4 1 5 ( 1 966). Murata, K., Shimizu, R., and Shinoda, G., Technol. Repts., Osaka Univ. 16, 121 (1966). Shimizu, R., Murata, K., and Shinoda, G., Technol. Repts., Osaka Univ. 17, 13 (1967). Archard, G., J. Appl. Phys.32, 1505 (1961). Bethe, H. A., Rose, M. E., and Smith, L. P., Proc. Amer. Phil. Soc. 78, 573

(1938). Lewis, H. W., Phys. Rev. 78, 526 (1950). Goudsmit,S.,Saunderson,J. L., Phys. Rev. 57, 24 (1940). Wentzel,G.,Z. Phys. 40, 590 (1927). Kulchitsky, L. A., and Latychev, G. D., Phys. Rev. 61, 254 (1942). Moliere, G., Z. Naturforsch. 3a, 78 (1948). Nigam, B. P., Sundaresan, M. K., and Wu, Ta-You, Phys. Rev. 115, 491

(1959).

Cosslett, V. E., and Thomas, R. N., Brit. J. Appl. Phys. 15, 235 (1964); 15, 883

(1964); 15, 1283(1964).

Cosslett, V. E., and Thomas, R. N., Brit. J. Appl. Phys.l6, 779 (1965). Wilson, R., Phys. Rev. 60, 749 (1964). Kulenkampff, H., and Spyra, W., Z. Phys.137, 416 (1954). Burkhalter, P. G., Bureau Mines Rept. Invest. 6681 (1965). Katz, L.,and Penfold, A. S., Rev. Mod. Phys. 24, 28 (1952). Glocker, R.,Z. Naturforsch. A3, 147 (1938).

Birkoff, R. D.,Handb. d. Phys. 34, 135, Springer, Berlin (1958). Compton, A. H., and Allison, S. K., X-Ray in Theory and Experiment, Van

Nostrand, New York (1935). Mott, N. F., and Massey, H. S. W., Theory of Atomic Collision, Oxford Univ.

Press, New York (1949). Worthington,C. R., and Tomlin, S. G., Proc. Phys. Soc. 69,401 (1956). Pockman, L. T., Webster, D. L., Kirkpatrick, P., and Harworth, K., Phys. Rev. 71,330(1947).

Perlman,H. S., Proc. Phys. Soc. 76,623 (1961). Castaing, R., and Descamps, J., J. Phys. Radium 16, 304 (1955). Henoc,J., J. Microscope 5, 122 (1966). Green, M., Proc. Phys. Soc. 83, 435 (1964). Andrews, C. L., Phys. Rev. 54, 994 (1938). Heinrich, K. F. J., The Electron Microprobe, eds. T. D. McKinley, K. F. J. Heinrich and D. B. Wittry, J. Wiley, New York (1966). Bucklow, I. A., Private Communication.

Ehrenberg, W., and King, D. E. N., Proc. Phys. Soc. 81, 751 (1963). Shimizu, R., and Shinoda, G., Technol. Repts., Osaka Univ. 14, 897 (1964). Wittry, D. B., J. Appl. Phys. 29, 1543 (1958).

295-798 0-68— 13
186 ELECTRON PROBE

APPENDIX I

I Scattering in a Coulomb field produced by a single charge is described by the well-known Rutherford scattering formula.

However, in an atomic field, the screening effect of the electron I cloud should be considered. If an appropriate atomic field is given,

these calculations become possible. Using a function g(y), the single

scattering cross section cr{6) may be expressed by

j z^e" g(y) i a (y) = — • — (1) p y I

where i y=sin(0/2)

j For g(y)=l, Eq. (1) gives the Rutherford scattering formula. To

estimate the screening effect, the screening angle Xa should bel defined as follows, (Goudsmit and Saunderson [7] ): 1 - 1 _

y„ 0 Jr. V

In _ - _ = / dy (2)

If we use the Born approximation and denote the scattering cross section by os, the screening angle Xo is obtained by substituting

gB(=o-BlcTR) into Eq. (2), as being the Rutherford scattering cros^. section. Two examples of the atomic field are given:

1 . Exponentialfield

T(r) = (zZ^eVr) exp(-A„r)

g(y)(^gB) is found by the Born approximation and

Y4

s(y) = — (4), y2 + y2

o From Eq. (2), Xo becomes

Xo = hA^/p = 2y^ (5] where i
SHINODA, MURATA AND SHIMIZU 187

Therefore, the screening parameter /S is

/3 = - yo (6)

i Since many discrepancies exist among the theoretically obtained

j values, K should be modified by comparison with experimental

I values.

I Introducing a constant /a, Nigam et al. [11] have proposed that

I ^=Mo (7)

j As stated already, for 20 keV in copper, /u- should be 1.12.

2. Thomas-Fermi field

TT, X zZ'(e') ^^ T^(r) = CO (rA„)

(g)

where

Xo=Z^/='/0.885ao

By numerical computation, we have

Xo = 1.12hXo/p (9)

Hence, we have reached the same conclusion, and this formula

gives good results, as shown already. In our calculation, an exponential field has been adopted; but for

the screening angle, we have reached the same conclusion as that deduced from the Thomas-Fermi field. Eq. (5) was first given by

Wentzel [8], where, a=ao was taken as the value of a in yo. But as shown above, a=0.885ao should be taken to obtain the proper value

of the screening parameter. In a paper read by Bishop at the Paris

Conference of X-ray Optics and Microanalysis, 1965, a similar

Monte Carlo calculation can be found. However, for the screening

parameter he did not use a modified one but that given by Wentzel.
i
ABSORPTION EDGE EFFECTS IN ELECTRON

PROBE ANALYSIS

D. NAGEL

Naval Research Laboratory, Washington, D. C.

Abstract

The numerical value of the mass absorption coefficient to use in calculating corrections is uncertain when an x-ray emission line used

in electron probe analysis overlaps the absorption edge fine structure of another element in the specimen. The Wp values

normally tabulated can be in error by ±50% near an edge and ±1 0%

up to 400 eV above the edge. Test calculations of absorption and

I fluorescence corrections show that an uncertainty in fJ-lp of 50%

I commonly leads to relative errors of 1-3% in the composition. In

I some cases the errors exceed 10%. The possible existence of such

line-edge interferences can be checked for a particular specimen

I using standard x-ray tables. A different x-ray line should be used if such an interference is found. When this is not possible, calculations

using a range of /"-/p values within the expected uncertainty will show the error in the concentration which might occur.

I. Introduction

Calculation of composition from measured relative x-ray

intensities requires accurate knowledge of the mass absorption

coefficient in electron probe analysis. It has been emphasized that uncertainties in the m/p values used lead to errors in the resulting

composition [l]. Uncertainties in the mass absorption coefficients

arise from two sources: (a) inaccuracies in the measured,

interpolated, or extrapolated values, and (b) errors in tabulations

due to not including variations in m/p near absorption edges. It is the

purpose of this paper to examine the situation where an x-ray line used for analysis overlaps the absorption edge fine structure, leading

to uncertainty in the WP value at the position of the line.

II. Physical Background

i The mass absorption is often required over a wide range of

j energies so the usual graphs and tabulations of p,/P are given on a keV scale. Figure la shows the common log-log method of plotting

189
190 ELECTRON PROBE

Figure 1. Conventional graphs of the Iron mass absorption coefficients in the

region of the K edge on (a) log-log and (b) linear scales [2]. The abscissa is in '

units of keV.

I the mass absorption coefficient which is useful since varies

approximately as E'^. A linear graph of the same region is shown in Figure lb. The absorption edge fine structure is contained within a

fraction of a keV of the edge and cannot be plotted well on the scale i of Figure 1 . An expanded energy scale, generally in electron volts, is |l necessary to plot the absorption edge fine structure. Figure 2, for ji, example, shows the Iron K edge measurements of White [3] for |) Iron in the pure metal and Fe-iOs. ji The region above an absorption edge (in energy) can be divided |i into two physically distinct parts. In the first 30 electron volts (eV) i or so above the edge, the fine structure, called Kossel structure, is [)! due to electron transitions to higher unfilled states when a photon jl

is absorbed. These transitions are between bound atomic states. Beyond about 30 eV, the Kronig fine structure may persist to as much as 400 eV above the edge. This is the case only for absorbers f with high lattice symmetry. In more complex and in amorphous*;

materials the fine structure extends to only about 100 eV above the * edge [6] . The Kronig structure is due to the effect of other atoms in

the solid on the electron ejected from the atom absorbing the x-rayl'i
NAGEL 191

/

I I I I I I I I I 0 40 80 120 160 200 240 280

ELECTRON VOLTS ABOVE ABSORPTION EDGE

1

i Figure 2. Linear graph of the Iron K absorption edge fine structure versus electron

volts relative to the K edge at 7.1 11 keV [3]. The curve for the metallic absorber

is displaced vertically from that of Fe^O} for clarity. Note the shift in the edge

position, and the difference in shape and magnitude of the fine structure for the metal and oxide.

i

I photon. Greatest variations in the mass absorption coefficient occur

in the Kossel region where the M/p value can vary from less than

50% to more than 150% of the tabulated value. In the Kronig region

the variations are typically about ±5- 10%. Figure 2 illustrates how

both the Kossel and Kronig structures can vary in shape and

magnitude, depending on the chemical environment in which the

absorbing element finds itself. It is significant also that the position

of the edge varies several e V from one compound to another.

Figure 3 is a schematic showing the extremes of the fine structure

in some absorption edges. The dashed line indicates the value which

would usually be tabulated or plotted. Superimposed on the edge

structure are four bars indicating emission lines at positions where

Wp would vary appreciably from the tabulated value. These might

be lines used to make a measurement in a sample containing the

I element whose absorption edge is shown.

1

I

1
192 ELECTRON PROBE

KOSSEL ^ i » KRONIG

STRUCTURE ' STRUCTURE

I ' 1 1 1 1 1 i__

0 20 40 60 80 100

ELECTRON VOLTS ABOVE ABSORPTION EDGE

Figure 3. Schematic of an absorption edge fine structure (solid line). The value of the mass absorption coefficient usually tabulated is shown by the dashed line. The bars give the widths of typical emission lines at positions where the actual I and tabulated absorption coefficients differ significantly. I

I

I The widths of x-ray lines commonly used in microprobe analysis i vary from about 2 to 12 eV. See Table 1 for examples. Since the ji period of undulations in the mass absorption coefficient is typically jl 15 to 20 or more eV, the lines are usually not sufficiently wide to l average over the variations. )

III. Effects of Line-Edge Interference

P Examination of wavelength and absorption edge tables [7] " shows that intense emission lines which might be used for probe

analysis (K and L a and (3 lines, 0.6 to 15 angstroms) frequently fall within 1 00 e V of an absorption edge. Some of these pairs of inter- fering elements are mutually insoluble, form no compounds, or are

unlikely to occur in microprobe samples. There remain, however, practical samples where emission lines overlap the

absorption edge fine structure. It should also be noted that there

are many instances when emission lines fall between the various

L or M edges. In those regions even the smoothed values of fi/p are less well known.
NAGEL 193

Table 1. X-ray line widths in electron volts

K lines [4] L lines [5]

z «l 02 Z ai ^1

Ca(20) 1.76 1.69 Ag(47) 3.2 2.4

Cu(29) 3.0 4.0 W (74) 7.2 6.5

Zr (40) 6.6 6.9 Pb(82) 9.5 8.4

Ag(47) 11.1 11.3 U (92) 13.1 14.3

Test calculations have been made for binary systems to illustrate the effect of uncertainty in /a/p, due to the presence of edges, on the

absorption and characteristic fluorescence corrections. Analytical

conditions and the composition were held constant, and corrections

calculated at 0.5, 1.0, and 1.5 of the tabulated /a/p value [l].

Philibert's expression for f(x), as modified by Duncumb and Shields, was used for the absorption correction. The fluorescence correction was calculated using the formula of Criss [8] which contains Reed's

expression for the effect of voltage on secondary fluorescence. The

results are given in Table 2. These calculations show that for the 50-50 or stoichiometric

compositions used, the uncertainties in the intensity ratios kg and

kf are usually 1-3%. However, in the 50 Mg-50 Ge system, a ±50% error in p./p produces an error in kg of + 18.4 or —7.2%.

For the intermetallic compound HfoCu, the error in kf is about 7%

due to the 50% p,/p error. The errors in kg or kf would be worse for

compositions nearer the end members. The analysis for Cu in Hf^Cu

provides an example of this. While errors in corrections for systems

near end members yield small absolute errors in the calculated

concentrations, the relative errors would be large. The above

examples are for errors appropriate to the Kossel structure. Errors due to Kronig structure are considerably smaller.

IV. Discussion

It is seen that uncertainty in the p-Zp value near absorption edges can lead to errors in the absorption and fluorescence corrections

which are unacceptably large in some cases. These errors can be
194 ELECTRON PROBE

Table 2. Effect of absorption coefficient veiriation on absorption and

fluorescence corrections

(20 keV, 30° takeoff angle)

Zi Z2 Wt.% Zi Lines Edge A(eV)^ fi/p ratio*" (k{)Z2

Br AAu 28.8 BrKai AuLiii 6 U.O u.yyu

(AuBr) AuLai 1:0 0.975 1.029

1.5 0.959 1.032 Hf Cu 15.1 HfL/3i CuK 24 0.5 1.099 (Hf2Cu) CuKni 1.0 d 1.178

1.5 1.248 Mg Ge 50 MgKa GeLiii 36 0.5 0.383 GeLai 1.0 0.199 d

1.5 0.127 Au Zn 50 AuLai ZnK 52 0.5 0.999 1.034 ZnKai 1.0 0.980 1.053

1.5 0.960 1.066 W Ni 50 WLai NiK 65 0.5 0.997 1.032 NiKai 1.0 0.960 1.049

1.5 0.936 1.061

Notes:

" A(eV) = difference between tabulated line and edge energies in electron volts [7 /i/p ratio = ifj-lp) actual/(/u,/p) tabulated. Concentration = (Relative X-ray Intensity) x (kabsorwion) x (k fluorescence) = rkak,. i Other lines would probably be used for an analysis.

outside the expected accuracy of measurement and calculation. The'

existence and source of such an error in the answer for one element

whose line overlaps an edge fine structure might not be obvious.

Normalization of the total composition to 100% would cause the error in one element to have an effect on the analysis for all the

elements in the system.

Instances of interference between a measured line and an edge are: relatively infrequent in binary probe samples, but become more

likely in ternary and more complicated systems. The existence of
NAGEL 195

such interferences can be checked most easily using Table 2 of

Bearden [7] where all x-ray lines and edges are listed in order of

energy. The region within about 400 eV below each line intended to be used in an analysis can be examined for the presence of the edge

of any of the other elements in the sample. Other tables of x-ray

lines and edges can be used also. If an interference is found, another line should be used if possible.

When this cannot be done, it must be expected that M,/p might be in error by ±50% within about 30 eV of the edge or by ±5-10% within

j 30 to about 400 eV above the edge. Since accurate absorption edge

I fine structure measurements are not available for all edges, and

I since the position of the edge and the shape of the fine structure

I depend on the chemistry of the sample, it is not possible to

I determine the difference between actual and tabulated m/p values

(except by measurement of Calculation of the absorption and

fluorescence corrections using values near the extremes of the

j range of variation (which depends on the line position above the

i edge) would show the sensitivity of the results to the mass

' absorption coefficient, or, at least, indicate the size of the possible

I error. When the p-/p uncertainty adversely affects one of the

corrections, changing the takeoff angle may alleviate the problem, if this is possible.

Measurements of broad soft x-ray lines, using a proportional or

scintillation counter to include the entire line, would tend to average

over flip variations near edges. Use of broad lines is not necessarily

advantageous, however, since microprobe correction procedures

are implicity derived for the usual narrow x-ray lines. The problem of line-edge interferences, discussed above for the

electron probe, exists similarly for x-ray fluorescence analysis. It can be expected to occur more often in the latter case since

fluorescence analysis samples can be physical mixtures, e.g., powders, and often contain many elements.

V. Acknowledgments

This problem was pointed out by Dr. R. Deslattes of the National

Bureau of Standards. The corrections summarized in Table 2 were

i calculated by J. W. Criss. The author gratefully acknowledges this assistance and the critical reading of the manuscript by L. S. Birks.
196 ELECTRON PROBE

VI. References !

I [l] Heinrich, K. F. J., "X-Ray Absorption Uncertainty", The Electron Microprobe.

John Wiley &, Sons, New York, 1 966.

[2] McMaster, W. H., et al., X-Ray Cross Sections, UCLRL Report 50174 Part II,

j January 1967.

[3] White, E. W., "Chemical Effects on X-Ray Absorption Edge Fine Structure",! Advances in X-Ray Analysis, Vol. 9, Plenum Press, New York, 1966.

[4] Compton, A. H., and Allison, S. K., X-Rays in Theory and Experiment, 2ndj

edition. Van Nostrand, Princeton, 1935.

[5] Blokhin, M. A., The Physics of X-Rays, State Publishing House of Technical-I Theoretical Literature, Moscow, 1957 and AEC-tr-J502, 1961. i [6] Van Nostrand, R. A., "Fine Structure in Absorption Edge Spectra", X-Rayi

Handbook, McGraw Hill Book Co., New York, 1 967.

[7] Bearden, J. A., X-Ray Wavelengths, Atomic Energy Commission, NYO 10586,

Oak Ridge, Tennessee, 1964.

f [8] Criss,J.W., "Progress in Quantitative Electron Probe Microanalysis", Fifty Years of Progress in Metallographic Techniques, ASTM STP 430, Am. Soc/

Testing Materials, 1967.

I

I

I

J

i/

I

If

If

f

|i

ri

;!

'i

I'
FLUORESCENCE EXCITED BY THE CONTINUUM

J. HENOC

National Center for Studies of Telecommunication,

Issy les Moulineaux, France

Abstract

The intensity of secondary radiation excited by the continuous

spectrum is calculated in a form suitable for computer evaluation of

the numerical values. The parameter of interest is the ratio of

secondary emission to the total emerging intensity of radiation; this ratio has been calculated for several elements choosing an

appropriate expression for primary radiation. The direct

I measurement of the ratio (I^(.4)/I(.^)) and of 1(4), performed on the

I same elements, provides a test of the correctness of the calculations

I and a basis for a proposed semi-empirical method for routine

evaluation of the corrections.

I. Introduction

A target being subjected to the impact of a beam of suitably

I accelerated electrons emits X radiation in the characteristic lines of

1 the atoms present in this target. The characteristic radiation is due to the ionization of the inner shells of the atom by electrons of the

beam and by the absorption of the continuum emitted during the event of electron energy loss in the material. Under normal

microanalytical test conditions, the first mentioned phenomenon

prevails, though it is no longer allowable to neglect the second one,

in view of the considerable advances achieved, especially in the field of spectrometer sensitivity.

We are going to set forth a method for calculating the intensity of

fluorescence radiation excited by the continuum in order to evaluate

the correction for it in the results of electron probe microanalysis. In

the first (theoretical) part we shall derive the formula for the

intensity of the fluorescence radiation and decide upon a method for

calculating the primary radiation directly excited by electrons in

I order to obtain the all inclusive ratio between intensities of

i fluorescence radiation and primary radiation. In the second, more

practical, part, we shall report on a few tests made, in order to

197
198 ELECTRON PROBE

render the application of calculations more explicit, and indicate a way of effecting corrections for fluorescence excited by the

continuum in routine analyses.

II. Theory

A. CALCULATION OF FLUORESCENCE EMISSION

The evaluation of the fluorescence emission excited by the

continuum is possible on the basis of two simplifying assumptions.

First, it is assumed that the continuous spectrum is emitted at a depth which is negligible compared with its depth of penetration

into the sample; this amounts to assuming that the primary radiation source is a pin-point source on the surface of the specimen. In a

general way, it is worthwhile noting that the distribution form of the

primary radiation as a function of depth interferes but little in the

calculation of fluorescence and that the intensity of the fluorescence

radiation is dependent only on the total intensity of the primary

radiation. It will also be assumed that the continuous radiation is isotropic.

The intensity of fluorescence radiation emerging from the

specimen due to excitation by the spectral component of the

continuum whose wavelength and intensity are X and \>S, respectively, with reference to Figure 1 , is given by the following

expression:

±__

dz

Figure 1. Emission of secondary radiation.
HENOC 199

li,A= r- ^ '^A CO J (A) — Z, (A)

4n 2

n

X d0 I tg(;6 exp j - pzl + 1- U d(pz)

o •'o ' \cos^ sine J)

477 2 fi^ Tfc [AB

/i£yi cosec ^"1

(1)

AB

y-A cosec AB

The intensity of the total fluorescence radiation is obtained by

finding the summation of this quantity over the range extending from

the minimum wavelength K to a wavelength A, of the level producing

the characteristic line chosen for the analysis, using as many

intervals as there exist absorption edges between K and A,. The

expression giving the intensity of the continuous radiation as a

function of wavelength, IX=KZ (I/Aq— 1/A) 1/A is due to Kramers

(1923) [I]; it is in good agreement with the empirical formula

proposed by Kulenkampff (1924) [2]. Green (1962) [3] has shown

that the constant K whose value was initially assumed equal to 2.26

X lO"!'' cm, varies with the atomic number. In case of a compound

specimen, we assume that we can write Z = Ca Z,i + Ch T^h- The

absorption coefficient variation law versus wavelength allows us to

' Note: list of symbols at end of the paper
200 ELECTRON PROBE

write fji^=iJi^^ (\/\o)^' provided that there is no absorption edge

within the interval (A.o, A/)- In the case of interval (kg. h) containing an absorption edge i, this expression is to be divided by the jump n

relative to the absorption edge at the instant of passing the latter. We

shall then write: ixi=tJi'f={fjiiolri) {klK)^

Substituting in (1) for 1$, /^i and /x^b results in:

m= o J m 477 2

H (A)

r,-l

Z,(A)KZ

AB

/x^ cosec

AB

~A

dA

m ( a>(A„,A^+,,v^«)-0 {Ko.Xm.yA (2)

EmAB =

4 77 2 'AB

r,-l

(A) Z, (A) KZ

Tic

(3) )
HENOC 201

0(Ao,A,v) =

_A _ v_ — IV arctg

2

(4)

AB

/ \3 f,^- cosec \^V^Bj = (5)

'AB

no

Formula (4) giving the quantity </> (Ao, A, v) can be tabulated by

i means of a computer in the following way:

j Ao is chosen among the values corresponding to the operating

voltage (5 — 45 kV, for instance, staggered 5 kV apart). For this

I value of Ao, A; is taken among K or L absorption edges of the various

t elements. The value of 4> is then read from the table, for v^ chosen in

I the range (0,100), staggering; 0.5. The </> function involving only

j wavelengths and parameter v^ can be tabulated once and for all.

j Figure 2 is a representation thereof.

It has been assumed that the wavelength variation interval

j contains no edge from element B. If this were not the case it would

I be sufficient to add merelv one extra interval being limited by the

absorption edge of B, by introducing into /a^^^ the edge jump ratio

{ relative to this edge. As an indication,Table I provides the values of

the different parameters in each wavelength variation interval.

I B. CALCULATION OF THE PRIMARY RADIATION

i The absolute calculation of the fluorescence radiation alone has

i only a theoretical interest, when one wishes to know its contribution

j to the total emerging radiation, as in the case of microanalysis.

295-798 0-68— 14
202 ELECTRON PROBE

A„ A V3 0 A/5 X 10

0.413 2.926 60.50 2.9677 5.5630

0.413 2.926 61.00 2.9704 5.5112

0.413 2.926 61.50 2.9731 5.4607

0.413 2.926 62.00 2.9759 5.4108

0.413 2.926 62.50 2.9785 5.3619

0.413 2.926 63.00 2.9812 5.3140

0.413 2.926 63.50 2.9838 5.2670

0.413 2.926 64.00 2.9864 5.2208

0.413 2.926 64.50 2.9890 5.1752

0.413 2.926 65.00 2.9916 5. 1307

0.413 2.926 65.50 2.9941 5.0870

0.413 2.926 66.00 2.9967 5.0437

0.413 2.926 66.50 2.9992 5.0016

0.413 2.926 67.00 3.0016 4.9600

0.413 .2.926 67.50 3.0041 4.9191

0.413 2.926 68.00 3.0065 4.8788

0.413 2.926 68.50 3.0090 4.8395

0.413 2.926 69.00 3.0114 4.8005

0.413 2.926 69.50 3.0137 4.7624

0.413 2.926 70.00 3.0161 4.7249

0.413 2.926 70.50 3.0184 4.6877

0.413 2.926 71.00 3.0208 4.6515

0.413 2.926 71.50 3.0231 4.6156

0.413 2.926 72.00 3.0254 4.5807

0.413 2.926 72.50 3.0276 4.5457

Figure 2. Calculation of Section of computer output.
HENOC 203

TABLE 1

X X

1 I 7 II '•in

(<i, i + fjj'nm'ni mCih-')

1 "^m 1 "^ni in ''lUM-1

ni M 1 ""inM 1 "^niM

r, K 'i n ''n m ''m M 1 'n ni 'in m i 'in m

^0 A A

1 A 1 A "x0 "xAg

1 'in 1 'i n 'n

0

AB "x'

1 A 'a ICa''^ -1- Cr^5Jc, \ + C„M?

1 'i n 1 'i n 'n ni

/i^cosecfl 1 /i^^cosec e 1 cosec 9 A

1 r *'x ,- B 1 ^ ^^x ^ B

1 "-A + Cb^^Xo 1 Ca ''o + CgMx^

1 'in ' 'in'nm

"x"

Therefore it is essential to evaluate it relative to the intensity of the

primary radiation. Assuming that the proportionality law between

emission and concentration holds for the primary radiation, one can

restrict oneself to the case of a particular element. Let Q (E, E/) be

the ionization cross-section; the number of ionizations, dn>i,

produced by an electron having an energy E and travelling over a

path element dx within a target made of element A is given by the

expression:

dn^ = Q (E,E,) dx

A
204 ELECTRON PROBE

The corresponding number of photons emitted in the L-line is

dl° , = CO; (A) Z, (A) — Q(E,E,) — dE

A dE

Over the path along which the energy decreases from Eo to E(, the , electron produces a total number of photons given by the expression I /El '

Q(E,E,) 2£ dE (6) : dE : K I

The quantity I°^)Can be calculated if the ionization function

Q(E, E,) and the expression for the electron energy-loss dE/dx

are known. One can use both formulas derived by Bethe as quoted

by Mott and Massey (1949) [4].

Q =-— bL — (7) where b=0.35 for K-shells

B b= 0.25 for L-shells

B= 1.65 E,^ (or E^)

Zni= No. of electrons of shell.

- — = — L

^

(8)

where

dx A E J

J= mean ionization potential

Substituting (7) and (8) in (4) results in:

bZ„, U r / 2EA / 2EA"1 2J

l;'^;=a;;(A) Z,(A) ]- Ei L )- Ei L L— + 2E,Z^ /2 L \ J / \ J /J B

+ E„ - E, V (9)

1;
HENOC 205

More recently, a rule-of-thumb formula has been proposed by

Green (1962) [3]. The ionization cross-section adopted by Green is derived from that established by Bethe in which the different

coefficients were modified according to indications by Worthington

and Tomlin (1956) [5]. The expression which has been chosen for the electron energy-loss, is the Thomson-Whiddington law (1912)

[6]. Green thus obtains the number of photons emitted in the Kspectrum in the following form:

where R is the back-scattering coefficient and c the ThomsonWhiddington constant.

C. CALCULATION OF V^H^a)

Expressions (2) and (9) for instance, permit the calculation of the

relative importance of the fluorescence radiation V(a ) excited by the

continuum with respect to the total radiation \(a) for a particular

I element. The calculation has been made for the zinc Karline, the

i tungsten, gold, and bismuth Lai-lines, with accelerating voltages of

30 kV, using the most recent values for the different physical constants relating to these elements. It is worthwhile noting that a

difficulty arises in the calculation of Lai-line intensities due to the

I fact that values for w/(A) appearing in (2) and (9) are not identical.

i Strictly speaking, instead of the fluorescence yield cu/j// relative to Li11 transitions, one should use an "effective" yield allowing for

Coster-Kronig transition coefficients. The situation is then different

whether we are confronted with an ionization event produced by

photons or by electrons. It is easy to observe this for 74 < Z < 83,

where, according to Listengarten (1960) [7] f23 = 0, the values for the "effective" fluorescence yield are listed in table I for ionization

by photons. Provided that the energy of incident electrons is markedly larger than that of L subshells, one can reasonably write

{o)u/i)eff. — itiun [1 + 1/2 fis]. Results of calculations are provided

below for a take-off angle of approximately 1 6°.

1.67

(10)

Element Zn

0.031 0.025 0.036 0.037

\(A)
206 ELECTRON PROBE I

i

III. Tests and Applications

Prior to entering into details relating to practical calculations of

corrections, we must check the results of the preceding paragraph.

This comparison with the acftial experiment can be made in two

steps. One can for each of the particular elements mentioned

previously first measure the total intensity emitted, and then measure directly the ratio by applying the aluminium

method. (See III. B below).

A. MEASUREMENT OF THE EMERGING RADIATION INTENSITY

The emerging radiation intensity of zinc was measured by

applying the double-filter method, the voltage being 30 kV. Besides

the value of the intensity emitted in the characteristic radiation Kai,

estimated at 1.73 x \0'^ phot/electron, this method permits the

evaluation of the K constant of Kramers' formula; we have found

that K = 2.64 x IQ-^^ cm. These experimental results are in good

agreement with measurements performed by Green (1962) [3].

Measurements made with a spectrometer on tungsten, gold, and

bismuth specimens can be rendered absolute by comparing with

tests made on zinc. The agreement observed between calculated and

measured values is considerably less consistent for La,-lines. In order to take the whole set of measurements into consideration, one

is led to adopt the following results:

Element Zn W Au Bi

f corrected .031 .022 .044 .048

1(A)

B. ALUMINIUM METHOD | This experiment consists of studying the characteristic radiation ' of a stratified specimen which, in fact, is a block of element A

' covered by a film of aluminium which is just sufficient for the energy

j of a traversing electron to be below the excitation threshold of

element A. The characteristic radiation of element A emitted by this :' specimen is therefore fundamentally the secondary fluorescence

radiation excited by the continuous spectrum emitted by aluminium \
HENOC 207

(Castaing and Descamps (1955) [8]). The intensity from the

stratified specimen, l'-f(A) is compared with the intensity 1(a) of the

radiation emitted in the same line by a pure standard A.

It is easily seen that the desired result is given by the formula:

1 ^^p\-f^ApA\x + k (e„ - e) cosec 6 \ I'L _ 1 L J

(11)

13 fi exp \ — [lA p^, ©o cosec d i ^(A)

i-(A)

where:

X=thickness of a layer of element A corresponding to a mean

emitting depth for primary radiation;

€=thickness of an aluminium layer corresponding to the mean

emitting depth for primary radiation, in aluminium;

! k= ratio between linear absorption coefficients of aluminium

and element A for the continuous spectrum;

eo= thickness of the aluminium layer

I The corrective term which is most difficult to evaluate is 1/fi (Kirianenko et al., 1964) [9]. It represents the proportion of the

continuous radiation being absorbed by the aluminium layer of

thickness (Co-e). It can be estimated by default by defining a mean

absorption coefficient; or, more simply, one can determine an upper

limit by comparing the intensity of the primary radiation which is absorbed in the layer with the total intensity of the continuous

radiation, assuming that the fluorescence radiation absorption in the

layer is negligible. The desired value is then easily derived from the

total intensity of the radiation emitted before absorption. As an example, let us quote the case of zinc for a voltage of 30 kV; the test

is performed by evaporating a 2 mg/cm^ aluminium layer on a polished zinc block. It is assumed that the emission takes place at a mean depth which corresponds approximately to 0.5 mg/cm^.

Before exciting the fluorescence radiation from zinc, the continuum

is thus partially absorbed by a 1.5 mg/cm^ aluminium layer.

On the one hand, if we adopt a mean absorption coefficient, we

are led to taking fi = 0.92; on the other hand, the aluminium layer

absorbs approximately 7% of the primary radiation; assuming that

half of the fluorescence radiation is absorbed in the target itself, the

contribution of this layer thus represents 0.07 x 2 x 3.^ 14% of the
208 ELECTRON PROBE

emerging fluorescence radiation, and fi = 0.86. It must also be

| pointed out that the theoretical calculation made for the stratified target would result in fi = 0.90. Figure 3 provides experimental I values for Calculated results of the previous paragraph have \ been plotted on the same figure taking into account the presence of

j an absorbing layer of element A, 0.5 mg/cm^ thick, in order to

| render results directly comparable. s

10

4

2

ALUMINUM I

CAl

30

VIETHOD 201 .CULATED 30

•

(V + —

/ / //

I +/

1/

ij /I

IJ

/

ll //

/-A

/ /

/

0 20 20 60 80 100 | ATOMIC NUMBER

| Figure 3. Ratio of indirect to direct x-ray production.

j

I C. DISCUSSION OF RESULTS I From the preceding, it appears that the lack of accuracy in calculated values can be ascribed mainly to the discrepancies

betweeen calculated and observed values of the characteristiCi

primary radiation intensity. Accurate measurements of this, radiation for elemental targets, though conceivable, represent a
HENOC 209

time-consuming, delicate, and wearisome work. Therefore, it is more advisable to have V(a)II(a) values provided by experimental

methods and to calculate corrections to be made when analysing

compound samples by means of tables. For the sake of exactness,

imagine the case of a compound AB in- which element A is to be

measured. For simplicity, let us assume that the other corrections

are negligible. Due to the presence of the fluorescence radiation

excited by the continuum, there exists between the true concentration C5 = I^/If/i) and the measured concentration

Cf =I3'/I(S), the following relation:

CT -

^A -

I?A> I (A)

1 -

\\a)

(12)

The method of calculating may be the following:

a. The terms E.^b and E.4 contain only the physical constants of

constituent elements and the concentration C.^; their calculation offers no difficulty.

b. (0m + i — (/)»,) .4 relative to the standard can be calculated by means of the table.

c. {(i>m + \ — 4'm).\B relative to the specimen can be calculated

by means of the table.

d. The value of the ratio ¥(a):\(a) is read from Figure 3. Thus

all quantities appearing in the right hand side of formula

(12) are available. The number of experimental results readily available may seem small. Indeed they are strictly

valid only for a take-off angle close to 1 6° and for voltages

of 30 and 20 kV. Attention must be drawn, however, to the fact that the take-off angle interferes only with parameter

V of the </) function for the fluorescence radiation. Referring

to the tables we have on the one hand:

iJaL, E e:? {$[Ao, a„ + ,. v:j(^,)i-ci)[Ao,A„,v:?(e,)]}

- J m

" i; E:?)a)[A„. A„ + ;, v:?(0,)]-$[A„.A„. v:?(e,)}

- ^ m
210 ELECTRON PROBE

and on the other:

is given by the absorption correction curves. As far as the ratio V(a)II(a) is concerned, it remains practically

[

constant over the range of the high voltages used.

Attention must be drawn to the fact that the formulas giving the

corrections for fluorescence excited by the continuum and the

characteristic radiation contain explicitly the concentration;

therefore, the correction can be made only by successive

approximations. As suggested by Philibert (1965) [10], a quick

evaluation of the different corrections allows one to place the true concentration in a certain range; one can then establish a

correspondence between true concentrations and measured

concentrations by means of the correction formulas. This method

can be advantageously used for fluorescence corrections by

applying the formula

(A)

^A + HA) ^{A) = (13)

1 +

TfHA)

jP

IV. Conclusion

j The application of fluorescence corrections can be greatly , facilitated if one has taken care to use to a maximum extent the[|

possibilities offered by the computer; the availability of tabulated! F values eliminates cumbersome calculations. One may ask the

question whether it is easy to forecast a priori the importance of the

correction. A mere glance at formulas ( 1 2) and ( 1 3) suffices to show

that the correction amount is an increasing function of the difference

Cjf — Qi (or C^C^) of the concentrations resulting from the emerging primary radiation and fluorescence radiation respectively
HENOC 211

It must be emphasized that the search after a general variation law

for the correction amount is rendered illusive by the fact that concentrations Cf and are relating to emerging radiations. A

first estimate can be quickly made if one evaluates, with the help of

tables, the ratio 1^:1^^^. A comparison between q[ and (or Qf)

allows one to decide whether or not the complete calculation is necessary. In a general way, one may assume that the error in concentration introduced by the fluorescence will be less than 0.005

if — C^'^"'^ < 0.05. It must not be overlooked that the results can

fluctuate by a ratio of 3 : 1 according to the take-off angle of the

microanalyzer being used.

To conclude, we shall make reference to two instances where the

ignorance of the fluorescence phenomena has led to gross errors. When analyzing a small size precipitate situated in a matrix of a

different composition, the primary radiation is that from the

precipitate and the fluorescence radiation is that from the matrix.

This instance was described time and again by Castaing and

Descamps (1955) and by Philibert (1964). Another, practically very

important instance, is that of the study of semiconductors where

concentrations chang.e quickly over a distance of only a few

microns. The fluorescence radiation must then be taken into

consideration in any case.

V. References

[I] Kramers, Phil. Mag., (1923) p. 836 jul. dec.

[2] Kulenkampff, Ann. Physik (4) 69, (1922) p. 548.

[3] Green, Thesis, University of Cambridge (England), ( 1 962).

[4] Mott and Massey, Theory of Atomic Collisions. Clarenton Press (1949).

[5] Worthington and Tomlin, Proc. Phys. Soc. A, 69. ( 1 956) p. 401

[6] Whiddington, Proc. Roy. Soc. A, 86. (1912) p. 360.

[7] Listengarten, Izv. Akad. Nauk Phys. Ser. 24. (1960) p. 1041.

[8] Castaing and Descamps, J. de Phys. 16, (1955) p. 304.

[9] Kirianenko, Henoc and Maurice, Rapport C.E. A. R.242 1,(1 964).

[10] Philibert, Me'taux, Corrosion, Industries 40, No. 465 '(1964) p. 157. Metaux,

Corrosion, Industries 40, No. 466 (1964) p. 216. Metaux, Corrosion,

Industries 40, No. 469 (1964) p. 325.

ELECTRON PROBE 213

Symbols

A, B

cCa, Cb

^ A Cm^ A E

Ei

E,

Ek, El,

e

fijn

I'a

I^A

Im

'(/I) I'f '(A)

J

K

L

riA N

Q

Atomic mass of element A , B

Constant in Thornson-Whiddington energy-loss equation

Mass concentration of element A , B

Electron energy

Exponential Integral

Incident electron energy

. . El K, Li . . . \ energy level Electronic charge

Coster-Kronig transition coefficient

Continuous intensity emitted at wave-length A. Primary emerging intensity from analysed element A

in a compound

Primary emerging intensity from pure A

Fluorescence intensity emerging from analysed ele- ment ^4 Fluorescence intensity emerging from pure A

Fluorescence intensity from element A in "Aluminium

Method"

Mean ionization potential

Constant in Kramers' formula

Natural logarithm

Number of ionizations in element A

Avogadro's number

Ionization cross-section

Absorption jump ratio

K, Li . . . absorption jump ratio

Back scattering coefficient

'm

A ZM)

Za, z

z

B

Thickness

I line relative intensity

Atomic number of element A, B
214 HENOC

z =

Number of electron in the / shell e Take-off angle

/ H.'oV/l ^ll^ll ^U^W WclV^ l&JI^Lll ividba d-Dburpiiun cuciiiL'ienL ui \/^d } lor a wdveiengin

rduictilun

fJ-AKh'-A I iVIdaa dUoUl JJllUll dJCiilL'lClH yjl. \rt£Jf V\Ji /I characteristic radiation

Pa , p Specific weight

<P Angular coordinate

fi Solid angle

a>i(A) 1 series fluorescence yield of element A

Liii^A) k, Liu fluorescence yield
QUANTITATIVE EVALUATION METHODS FOR

ALLOY MICROSTRUCTURES BY MICROPROBE

ANALYSIS

GERHARD DORFLER

Analytisches Institut der Universitaet Wien, Austria

Abstract

The methods of stereometric analysis are of great interest in metallurgy, mineralogy, and other branches of science concerned

with the properties of solid materials. Until now, practically all stereometric studies were performed by employing light

microscopy.

The electron probe microanalyzer is a most valuable tool for

stereometric analysis; this application has not been fully recognized

as yet.

The present paper reviews the methods of stereometric analysis,

and presents suggestions for further improvement of electron probe

techniques specifically designed for these methods.

I. Introduction

During recent years, methods of stereometric analysis, called

"quantitative metallography" in physical metallurgy, or "modal

analysis" in mineralogy, have gained considerable interest. The

general methods have been available for several decades; today,

however, the far-reaching application of stereometric analysis is mainly due to the availability of automatic measuring devices.

The knowledge of structural parameters representative of the

micro or macrostructure of a solid is of very great interest for solidstate research. Volume fractions, surface areas per unit volume, and

grainsize distributions play an important role in the understanding of

diffusion processes, reaction kinetics, homogeneity, and physical

properties of solid materials. Until recently, practically all methods

for measuring these quantities have employed light microscopy. A

detailed discussion of all instruments presently available is given by

Fischmeister (1966) [l]. In some cases, transmission electron

micrographs have been used for stereometric measurements (H. E. ExnerandH. F. Fischmeister, 1966) [2].

215
216 ELECTRON PROBE

Analysis by light microscopy suffers from limited spatial

resolution because the reflectivity and the transmissivity of a phase

is a physical property not always directly proportional to the j chemical composition of this phase. A great many other factors also | influence these properties strongly, e.g., orientation, surface finish in

j metallic systems; moreover, the etching of a sample changes

considerably the correlation between chemical composition and ! reflectivity. i Therefore, in a great many cases, the differentiation of phases of I nearly the same reflectivity is not always possible within one | sample, especially when applying automatic measuring devices.

The electron microprobe has been proven to be a very valuable ! tool for the determination of the chemical composition of phases and ,

it has nearly the same spatial resolution as the light microscope. This

j instrument, therefore, lends itself for an application in the field of i stereometric analysis, especially since the scanning microprobe ! designed by P. Duncumb and V. E. Cosslett (1956) [3] offers the

ability to scan the sample in straight lines. Thus, the most

^ sophisticated method of stereometric analysis, linear analysis, can

also be accomplished with the microprobe. It was not surprising that I several attempts in this direction have been made independently by I different investigators; the individual instruments will be discussed

| in sections III. and VLB.2. I The present paper attempts to give a survey of the methods of I stereometric analysis, and of the instruments which are presently

| used in combination with the microprobe, and to discuss the I principles of the analytical method in detail. The usefulness of the ( system shall be illustrated with several recently investigated ( examples and by the enumeration of further possibilities of i- application. i In the following chapters the current state of the instrumentation;

will be described, with further suggestions to improve the method in f the hope that this will stimulate discussion and further

developments. |)

II. Methods of Stereometric Analysis (1

Since the first use of the light microscope for the investigation ofl opaque material, attempts were made to obtain not only qualitative

but also quantitative knowledge of the microstructure encountered.

A. Rozival (1903) [4] and E. Heyn (1903) [5] developed the first
DORFLER 217

quantitative analytical procedures for measurements on

microstructures. Subsequently, the publications of E. Scheil (1935,

1936) [6,7], C. S. Smith and L. Guttman (1953) [8], S. A. Saltykov

( 1 958) [9] , J. Hilliard and J. W. Cahn ( 1 96 1 ) [ 1 0] , and others have

shown that a great many parameters, representative of the threedimensional structure of opaque samples, can be obtained from

measurements on randomly oriented two-dimensional planes.

Until the last decade, these methods found almost no application

in the normal research laboratories. This was mainly due to the lack

of automatic measuring devices as the manual measurements in stereometric analysis are extremely tedious. (Only in the last ten years have automatic measuring devices been commercially

available.)

Let us now discuss the basic principles of stereometric analysis

and the structural parameters which can be derived from its results. For a more thorough presentation of this subject, reference should

be made to the following books: S. A. Saltykov (1958) [9], H. Elias

and E. Weibel, ed. (1967) [11] and E. Underwood (1967) [12].

Two different measuring methods are known in stereometric

analysis — measurements along a line, called lineal analysis — and

the point-count techniques. Commmon to both methods is the fact that the results from measurements on a plane have to be related to the structure in the volume by statistical procedures. The theory of

stereologyi states that either the phases or the analyzing means —

lines or points — have to be distributed randomly. This means that

] straight parallel lines or systematically arranged points can be used

5 for the analysis only if an isotropic, statistical distribution of the

phases is assumed. Otherwise the conclusions drawn from the

measurements on a plane about the conditions in the total volume

would be incorrect.

If the phases show an oriented distribution, a disoriented

analyzing device has to be used. In lineal analysis this will be a circle since a direction change is made at each increment; in the pointcount technique, randomly distributed points are used.

In Table 1 , the structural parameters and the methods by which

they can be obtained are listed. According to investigations by A.

. Henning (1958) [13] and by J. W. Cahn (1961) [10], the pointcount technique is the most efficient method for volume-fraction

analysis. However, if other parameters are needed, only lineal

'This name has been chosen by the International Society for Stereology, which

, deals with subjects concerning the three dimensional structure of matter.

295-798 0-68— 15
218 ELECTRON PROBE

Table 1

Volume

fraction

Number of Surface/ Mean Grains! ze particles/ volume diameter distribution unit vol. Anisotropy Proximity

lineal analysis + + + + + + +

point count

analysis + + +

analysis can provide them. Even the simultaneous determination of

all parameters during one analysis is possible by this method. The

method to be chosen depends mainly on the problem to be solved.

Let us now consider the individual parameters briefly.

This parameter is most commonly used in metallurgical and

mineralogical investigations, because the volume fraction of a

particular phase very often has a strong influence on the physical

and mechanical properties of a material. The values obtained on a

j plane can practically always be converted to volume fractions,

j Furthermore, the reliability of the analysis can be given accurately

| as mentioned in section VIII. B. In lineal analysis, the total sum of j all intercept lengths of the analyzing line falling within a particular

phase is compared with the total length of the analyzing lines (Fig. i

1). Applying the point-count technique, the percentage of the total i points falling within the encountered phase is registered. i

The knowledge of the surface areas of individual phases is , naturally very important to the understanding of diffusion processes, I kinetic processes, grain growth, etc. Furthermore, it has been shown

by several authors (Saltykov, 1958) [9] that the amount of surface

' area present in a solid very strongly influences several physical

properties such as electric conductivity, hardness, and tensile f strength. ^ For the calculation of the surface area per unit volume, it is \ necessary to register not only the sum of all intercept lengths but I

A. VOLUME FRACTIONS

B. SURFACE AREAS PER UNIT VOLUME
DORFLER 219

Figure 1 . Principle of lineal analysis: l^=intercept length of phase a; intercept

length of phase (3.

also the number of intersections with that particular phase; i.e., 2 Sy = surface area (mm^/mm^)

Sf = = — = number of intercepts ^ L = length of test line within the phase

L = mean grain diameter

C. MEAN DIAMETER OF A PHASE

This value can be calculated from the same data used for the

surface areas:

This provides a very convenient means for the rapid and simple

characterization of grainsize.

D. PROXIMITY

This parameter has been introduced very recently to stereology

by the author (Dorfler, 1966) [14]. It makes an attempt to quantitatively characterize the arrangement of phases, which was

not possible up to now. Figure 2 shows the basic principle for a three-phase sample. From the number of sequences and the

intercept lengths of the individual phases, the proximity of one

phase respective to all others can be calculated. In the example

schematically shown in Figure 2, it can be seen that in case a) all the
220 ELECTRON PROBE

C — B

Figure 2. Principle of sequence analysis: 2a: Phase A totally surrounded by phase ' B, Proximity P^/b=100%, P^/c=0%; 2b: Contacts between phases A, B, and C,

P4/fl=80%, P^,c=20%. !

surface area of phase A is in direct contact with phase B (P/i/b — j 100%) while no contact area exists between A and C (P.4/r — O). In

| case b) 80% of the total surface area of A has contact with B (P/i/s = \ 80%), the remaining 20% being surrounded by the phase C (Pa/c = 1) 20%). It is easily recognizable that the knowledge of this parameter

is very important for quantitative calculations in reaction kinetics p and diffusion processes. The sequences can be registered ij automatically by means of the sequence analyzer (Dorfler, | 1966) [15], which will be described in section VI. C. 3. |i

S f p^/y = 100 (%) y

Pa/u = proximity of phase A to B

^A/o ^ surface area of phase A in contact with phase B t = total surface area per unit volume of phase A
DORFLER 221

E. GRAINSIZE DISTRIBUTIONS AND NUMBER OF PARTICLES PER

UNIT VOLUME

Both parameters are very important for detailed investigations in the field of nucleation and grain growth, as well as for the accurate

description of microstructures. However, the methods for the

analysis and for the calculation are rather complicated and cannot be

discussed in detail in this paper. (Refer to section VI. C.4.)

Very detailed discussions of the problem can be found in the

papers of E. Scheil (1935, 1936) [6,7], S.A.Saltykov (1958) [9], R. T. DeHoff (1962, 1965) [16,17], H. E. Exner(1966) [18,19]

and G. Bockstiegel (1966) [20].'

The determination of the number of particles per unit volume is even more complicated and depends on a knowledge of the shape of

the encountered particles. Discussions and references can be found

in the above mentioned papers. Other parameters, such as anisotropy, topological parameters

(continuity, connectivity) etc., can be determined by these methods;

and it is felt that additional parameters would be necessary for a

representative description of a microstructure.

III. Automatic and Semiautomatic Devices, Using the Electron Probe

The advantages of the use of the electron microprobe for

stereometric analysis has been pointed out in section I. In 1964, two similar arrangements were proposed: R. Theisen

[21] modified a line-recorder to operate as a switch, which allowed

the counting of the number of interested inclusions, provided that the concentration of a certain element exceeded a preset level. In combination with a special x-ray pulse-count technique, Theisen

obtained the mean particle size and anisotropy value for FeAla

inclusions in SAP (sintered aluminium powder).

D. A. Melford and K. R. Whittington (1964) [22] published at the same time the development of an "inclusion counter" which was

mainly based on a computer technique, which analyzed the x-ray

and backscatter output of the microprobe. The phases or inclusions

are distinguished by the presence or absence of three elements (x- ray analysis) and by the value of the mean atomic number as given

by the intensity of the backscattered electrons. If a phase is identified, sizing circuits are activated, which record the number of

^ For a conversion into a size distribution in space, a convex shape of the particles has to be assumed. Some older theories deal only with the distribution of ideal spheres.
222 ELECTRON PROBE

intercepts falling into a special size class. A special provision is made to avoid the counting of an inclusion twice while analyzing on subsequent lines. This method provides an extraordinarily high

speed, the analysis on a field of 500 x 500 /x'^ being performed in 30-60 seconds (Figure 3).

INPUT SIGNALS

MICRO \

TO AVOID DOUBLE COUNTING

LOGIC

CIRCUIT COMBINE

INPUT SIGNALS

VARIOUS WATS

SIZING

CIRCUITS

I SIZES

MAGNETIC

MEMORY

DRUM

- 12 —

:'INHIBIT';

• LINES -

12 'COUNT LINES'3

ANTI- COINCIDENCE

CIRCUITS

12 BINARY

STORES

PRINTOUT

•• OR

READ OUT

Figure 3. 1966).

Schematic diagram of the "inclusion counter" (Melford and Whittington,

However, the method of Theisen as well as the "inclusion

counter" are restricted to the analysis of phases, which differ qualitatively (by the presence or absence of at least one element)

from the matrix. If the same elements are present in two phases, but

only in differing concentrations (e.g., ferrite/austenite), these

instruments cannot distinguish between them.

In 1965 two further instruments were introduced by P. Weinstein

[23] and by G. Dorfler [24]. Though they use very similar

principles, they have been developed independently. Their i arrangements have been strongly influenced by the development of i discrimination circuits for the improvement of x-ray scanning,

published by K. F. J. Heinrich (1962) [25], D. A. Melford (1962)

[26] and M. Rouberol et al. (1962) [27]. Since the two instruments

are so similar, they can be discussed as one system.

The basic principle of the apparatus, called "phase integrator", is shown in Figure 4. A signal of the electron microprobe (x-ray, target

current, etc., ref. to section V.) is fed into a discriminator circuit,

where the identification of the selected phase is accomplished. If ' the signal voltage remains within the lower and the upper threshold

limits, a constant voltage is supplied which opens a gate. Through I the open gate, pulses of constant frequency, which are produced by ^ an external oscillator, can pass to the analyzing circuits. The pulse

groups obtained by this way represent the intercept length of the
DORFLER 223

scanning area

scanning line

upper threshold

ratemeter voltage

lower threshold

B

discriminated

ratemeter voltage

_ D

t [seel

Figure 4. Principle of the "Phase Integrator" (Dorfler and Plockinger, 1966).
224 ELECTRON PROBE

linear analysis and can, therefore, be analyzed to give all structural parameters desired. A detailed discussion of the discrimination

circuits is given in section VLB.

The same possibilities for obtaining stereometric data have been

pointed out recently by K. F. J. Heinrich (1966) [28], in an

expansion of the concentration mapping device.

IV. Basic Techniques of Analysis

Since most operations are common to all techniques, the basic

procedures shall be discussed in this section. Not only the present

state of knowledge, but also some suggestions for further

improvements will be discussed.

A. THE SCANNING PROCEDURE

The basic technique of scanning a focused electron beam on a sample was originally developed by M. von Ardenne (1938) [29] for

his scanning electron microscope. However, this technique found no

far-reaching application until P. Duncumb and V. E. Cosslett (1956)

[3] introduced it into electron-microprobe analysis. The great

advantages and the limitations of this technique have been

thoroughly discussed several times, recently in great detail and with

special reference to the quantitative interpretation of data by K. F. J. Heinrich (1967) [30].

1 . Lineal Scanning

Practically all scanning devices included in commercially

available electron probes shift either the electron beam or the

specimen in two orthogonal lineal movements. The displacement in the X-axis is normally by a factor of 10 or 100 faster than the shift in the y-axis. Let us now consider the features which should be included in a

universal scanning device in order to fulfill all requirements of

stereometric analysis; these are strongly influenced by the analytical

problem to be solved. Figure 5 gives a general impression of the

relationships. Depending on the grainsize and the distribution of the

phases, a proper line length has to be chosen. The distance between

two subsequent lines is also affected by the distribution of the

phases, in order to give a representative number of particles. The

number of lines has to be selected to give the accuracy required for the analysis (ref. section VIILB.).
DORFLER 225

NUMBER

OF LINES

SAMPLE

GRAINSIZE

DISTRIBUT.

INTENSITY

OF X-RAY

LINE- LENGTH

LINE- SPACING

DISCRIM INATION

TIME- CONSTANT

LAT RESOERAL

.UTION

OPTICAL

SCANNING VELOCITY

Figure 5. Best way of selecting the scanning parameters.

Thus it should be possible to select line length, spacing, and the

number of lines independently of each other. This is, however,

nearly impossible in commercially available scanners. In these, the

scanning field is normally a square, the side length of which is set by

the magnification control. Furthermore, both motions, for the line- and for the frame-formation, are continuous. These facts mean that

the above mentioned parameters can not be selected independently.

This can be demonstrated by the assumption that the motion vertical

to the line scan is in the same order of magnitude as the horizontal.

Figure 6 shows an extreme case. It is apparent that the square is distorted, which may influence strongly the analysis, if the

anisotropy or orientation of a phase is determined.

In Figure 7, an arrangement is proposed (G. Dorfler, 1966) [15],

which includes all features demanded above. The x-deflection of the

electron beam is directed by a sawtooth generator (1), the peak-topeak voltage of which can be varied within a wide limit by means of

a precision potentiometer. This voltage is supplied to the scanning

plates of the microprobe and the CRT. To obtain a stepwise

deflection in the y-direction, the sawtooth is differentiated in (2). Each end of a scanning line is therefore marked by a pulse. In (3)
226 ELECTRON PROBE

X =m

J

I

Figure 6. Influence of a continuous movement in the y-direction of the scan on

the shape of the scanned area.

this pulse is formed into a square wave which has a well-defined

charge. This pulse charges a loadsensitive amplifier which consists

^ of a potentiometer (4), a differential amplifier (5) and a capacitor (6). j At the potentiometer (4), the load supplied to the amplifier is f adjusted; this regulates the voltage obtained at the ends of the

j capacitor. Since this voltage is supplied to the deflection plates of ' the microprobe and the CRT, the resistor (4) determines the

| distance between one line and the next. Each step in the y-direction

is registered by the preset counter (ZW). If the preset number of i lines is reached, the counter generates a pulse which actuates the

| AND-gate (7) and thereby shortcircuits the capacitor (6). This i results in the resetting of the y- voltage to the initial value at the first

line. Thus, by this device, the line length can be selected at the ^ sawtooth generator (1), while the linespacing is determined by the i position of the potentiometer (4). The y-motion is triggered by the

^ steep slope of the sawtooth, i.e., the line end. Therefore the line . length, the scanning speed and the line spacing can be selected , independently.

The y-motion can consist either of a deflection of the electron ! beam or of a displacement of the sample. Instead of the above
dOrfler

Figure 7. Proposed arrangement for step-scanning in the y-direction: l=Sawtooth

generator; 2=differentiator; 3=pulse shaper; 4=potentiometer for step-height

selection; 5=operational amplifier; 6=capacitor; 7=AND-Gate; ZW=preset

counter (selection of the number of steps).

mentioned charge-sensitive amplifier, a digital-to-analog converter

could be used to produce the stepwise y-motion. The two

potentiometers at (1) and (4) can be calibrated (ten-turn

potentiometers) to enable the selection of a certain line length or spacing at a given accelerating potential. It is very important in stereometric analysis to work with exactly defined line lengths

because several parameters (grainsize, grainsize distribution, etc.)

depend in their precision on the accuracy of the line length

measurement.

In addition to the necessity of an extremely flexible scanning

device, provision should be made to scan several areas on the same

sample automatically and sequentially. By means of an electromechanical step-scanning device, one field can be linked up with the

next, enabling the accurate exploration of large areas and the

programmed search for unknown or scarce phases.
228 ELECTRON PROBE

2. Point-Scanning

This technique has been recently introduced into microprobe

research by L. S. Birks (1963) [31], who used a multichannel

analyzer for the convenient storage of quantitative point counts

distributed on a grid, scanned by the electron beam on the sample

surface. K. F. J. Heinrich (1966) [28] also described this possibility,

using a 1600 channel analyzer and showing not only the digital

printout, but also the visual display on the CRT, where the "threedimensional" presentation is very instructive. The paper-punch and

magnetic-tape readout facilities of these systems allow a subsequent

analysis of the data in a computer. (K. F. J. Heinrich, private

communication.) Some possibilities for the application to stereometric analysis are discussed in section VI. D. The first system directly devoted to stereometric analysis was

proposed by K. Keil (1965) [32]. He used an electro-mechanical

step scanner to obtain a systematic point scan. At each point, the

signals for three x-ray spectrometers, the target current, and the

cathodoluminescence were used to decide which phase is present.

The decision can be made either by the operator or by an automatic

device.

Generally, the point-count method has the disadvantage that not very many parameters can be determined by this technique (ref. section II.). However, this method seems to be extremely valuable

for the discrimination of phases with very small concentration

differences because a preselected statistical reliability can be

obtained by using the fixed-count method. A further application of

the point-count method is the determination of the homogeneity of

single-phase or multiphase samples (K. F. J. Heinrich, private

communication).

V. Signals of the Microprobe and Their Use for Stereometric Analysis

To obtain a stereometric analysis by means of the microprobe,

all signals obtained while scanning over the sample can generally

be used. It is very important to point out that for this type of analysis no quantitative determinations are needed. It is only necessary

that the signal differences between the phases present be great

enough to make an accurate discrimination possible. This causes

j some points of view which are partially different from the normal'

discussion of the signal sources of the electron microprobe.
DORFLER 229

A. X-RAY SIGNALS

Originally, the microprobe was designed for the determination of

the chemical composition of microvolumes by means of the

characteristic x-ray emission. Since the chemical composition is in nearly all cases the most selective means for a discrimination, the

detection of the characteristic x-radiation should be discussed in

detail. It must be mentioned, however, that not only the

characteristic radiation, but also the intensity of the white radiation can be used to distinguish between different phases (F. R. Park et al. 1966) [33]. These authors obtained a resolution of 2.5 atomic

numbers at a wave length of 0.60 X and 30 kV acceleration potential.

When using characteristic x-rays in scanning-microprobe analysis,

and especially in stereometric analysis, some characteristics caused

by the quantum nature of the x-rays have to be considered. This may

be illustrated by an example. If two phases are present in a sample, one of which contains 20% and the second 25% of a certain element,

the coefficient of variation has to be at least 0.1 (= 10%) to make a

discrimination possible. Applying pulse-counting statistics, the

coefficient of variation is given by the formula

V = -J—

From this it can be calculated that at least 1 00 counts have to be

accumulated on the phase containing 20% (100 ± 10 counts).

Therefore 120± 11 pulses will be obtained on the 25% phase.

For an accurate discrimination, a confidence limit of 68.3 (1 o") will not be sufficient. Therefore, very high counting rates should be

used for the purposes of stereometric analysis whenever possible. In the case of a point-count analysis, the coefficient of variation to be reached can be obtained by the proper selection of the number of

counts accumulated (fixed-count method). If, however, lineal analysis has to be applied, the integration time is given by the time

constant of the ratemeter (t) which acts as a digital[^-to-analog converter. With the time constants normally used for lineal analysis

(10 msec — 1 sec), the actual counting rate is considerably reduced,

e.g., for = 0. 1 sec to 10% of the count rate. If the periodic pulse integrator proposed by K. F. J. Heinrich

(1964) [34] is used, the integration time is much better defined than

that of a ratemeter. The ratemeter and the pulse integrator will be

discussed in more detail in section VI. A.
230 ELECTRON PROBE

From these considerations it can be concluded that, depending on

the discrimination problem, in most cases a high counting rate, and

therefore better statistics, is more favorable than high peak-tobackground values. Therefore, if applicable, nondispersive counting

systems will give much better results in stereometric analysis than

dispersive systems. This is especially true if the fulfillment of the

Rowland circle condition is considered. When scanning the electron

beam on the sample, the focusing conditions of fully-focusing

spectrometers are fulfilled only along a line, depending on the

characteristics of the spectrometer. If the beam is deflected in a

direction normal to that line, a considerable loss of counts can be

observed (H. Malissa, 1966) [35]. As K. F. J. Heinrich (1967) [30]

has pointed out, this can be avoided in the following ways:

1. To restrict the width of scanning (smaller than 50 fim). This

method is not applicable for stereometric analysis.

2. To use scanning by mechanical displacement. This method is especially suitable for stereometric analysis, because the pulse rates obtainable with dispersive methods permit in most cases only slow

scanning velocities.

3. To employ signals other than x-rays. This possibility will be i discussed in the following section.

4. To use semifocusing or nondispersive x-ray spectrometers.

^ Since nondispersive methods give higher counting rates up to a j factor of 1000 (P. Duncumb, 1964) [36], they are especially j suitable for our demands. A further improvement could be obtained ! by applying the recently developed solid-state x-ray detectors, ' which show an exceptionally good energy resolution and are capable

| of analyzing radiations down to TiKa. Since these detectors are | very small, they can be placed near the sample at a high take-off I angle.

|

B. TARGET CURRENT

The fraction of the beam current absorbed by the specimen is a

| function of the mean atomic number of the encountered area and of | the surface topography. Analyzing a well-polished sample, the I target-current variations can be attributed to the atomic-number

variations. If the differences in atomic number of the phases present i are great enough, the selection of these phases can be very easily j made by the target current. This signal has the very great advantage 'i that it has a very small time constant and that the spatial resolution
DORFLER 231

is better than that of the x-ray signals. Therefore, a much higher

scanning speed can be obtained. Very detailed accounts on the

theory and the use of the target current have been given by E. Weinryb(1964) [37] and by K. F. J. Heinrich (1964) [38].

C. BACKSCATTERED ELECTRONS

Backscattered electrons consist of two main classes, the

elastically scattered electrons and the secondary electrons. The

elastically scattered electrons show the same dependence on the

atomic number of the target as the target current. However, the

development of a "stereo monitor" (S. Kimoto and H. Hashimoto,

1966) [39] permits the separation of atomic number and topography

effects. The principle is demonstrated by two illustrations from the

above mentioned paper (Figures 8 and 9). Two solid-state electron

detectors are used. If the sum of both signals is used, all topographic

effects are eliminated and only the atomic-number signal is obtained. In the subtraction mode, the topography signal can be observed.

(a) (b)

Figure 8. Signals from multiple detectors and their combination for simple speci- men (Kimoto and Hashimoto, 1966).
232 ELECTRON PROBE

LyJ

Deflector Mb

A

Detector

Electron gun

Condenser lens X

Specimen

Balancer

Adder [-| Cathode-ray

oscilloscope

Subtractor

Figure 9. Arrangement of the "stereo detector" (Kimoto and Hashimoto, 1966).

For stereometric work, both signals can be used. In the

"composition mode" it is possible to get rid of all topography

effects, in the "topography mode" the structural parameters of

pores, cracks and grain boundaries (if etched) can be evaluated.

Not very much is known about the applicability of secondary

electrons to the characterization of phases. It may be that there are some very useful applications for phase discrimination.

D. CATHODOLUMINESCENCE

Light emission under the irradiation of the electron beam has been

shown to be a very valuable tool for the rapid identification of

mineral phases. Table 2 gives some observations compiled from the

literature (K. Keil, 1966) [40]. The use of monochromators and a

photomultiplier should enable a very rapid stereometric analysis of

several mineral phases. The spatial resolution of the method is excellent (K. F. J. Heinrich, 1967) [30].

An extremely interesting development has been published by D.

Kyser and D. Wittry (1964; 1966) [41,42]. These authors recorded

the infrared luminescence caused by the beam-irradiation on

semiconductor specimens. Since intensity variations can be

attributed to variations in the concentration of impurities or crystal

imperfections, this seems to be a way to obtain stereological

parameters where no other method is applicable.
DORFLER 233

Table 2

Color

Mineral Blue Red Orange Yellow Green

enstatite^ + +

plagioclase +

oldhamite +

quartz +

sinoite

calcite (0.13Mn/0.2 Fe)

dolomite +

(0.07 Mn/0.8 Fe)

^color depends on Mn-content

VI. Analyzing Circuits

The characteristic signals mentioned in the preceding section

have to be analyzed in order to permit an exact phase identification

and to obtain appropriate readings which can be converted to

! stereometric parameters.

Besides the ratemeter and the pulse integrator, proposed by K. F.

J. Heinrich (1964) [34], no other instruments, incorporated in the

microprobe to detect and amplify signals, shall be discussed here.

A. RATEMETER AND PULSE INTEGRATOR

If lineal scanning methods are employed, a digital-to-analog converter has to be used to produce a continuous signal while

registering x-ray pulses. These integrating devices have certain

characteristics which largely influence the accuracy of the phase

discrimination.

In the conventional ratemeter, a combination of a resistor and a

capacitor is used for the integration (Figure 10a left). With this arrangement, a sudden change in the counting rate does not result

1

I

I

295- 798 O 68—16
234 ELECTRON PROBE

in a sudden change of the ratemeter voUage but is smoothened by

the time constant {ct= R-C). Figure 1 la (right) shows the effect of

the time constant on the output voltage after a sudden rise in the

pulse rate. It can be seen that after 4cr the maximum value is nearly

reached. The attainment of the maximum value however is absolutely necessary to obtain quantitative results (ref. section VIl.).

Therefore, the time constant of the ratemeter is a serious limiting

factor for the scanning speed and the spatial resolution.

The periodic pulse integrator (K. F. J. Heinrich, 1964) [34] seems to be a great improvement in this respect. The principle is given in Figure 10b. At the output, a "block diagram" is obtained,

the width of each block depending on the time of the storage cycle

(t), and the height being proportional to the number of counts

accumulated during the cycle. The great advantage of this system is the fact that the integrator disregards all information stored before

the integration cycle. By this way, the "tailing effect" of a

conventional ratemeter is avoided. Furthermore, the integration

time, which determines the statistical accuracy of the pulse-rate

determination, is much better defined than by the time constant of a

ratemeter.

B. DISCRIMINATOR CIRCUITS

Discrimination units have been well known for a long time and

have been applied to energy analysis as well as to threshold

switches. As was mentioned earlier, these circuits have been

introduced to electron microprobe work by K. F. J. Heinrich (1962) I [25], D. A. Melford (1962) [26], and M. Rouberol (1962) [27]. ; As can be seen from Figure 4, the signal voltage is fed into a

j discrimination circuit, where a lower and an upper threshold limit

^ can be selected. If the signal voltage obtains values between the two i; selected threshold settings, a constant voltage is available at the

output of the discriminator. If, however, the signal level is below the

lower or above the upper threshold limit, no voltage is obtained at the output of the discriminator. This means that the analog signal isj converted into a digital "yes or no" decision, determining whether

the phase is present or not. This method has been developed to a very sophisticated degree by

K. F. J. Heinrich (1962, 1964, 1966, 1967) [25,28,30,34] and can}!

analyze all signals mentioned in section V.
DORFLER 235

%

100 1

80 -

60 -

40 -

20 -

b 0 1t2t 5t ^^t

Figure 10. Basic differences between the ratemeter and the periodic pulse inte- grator; 10 a: Diagram and time-response to a sudden rising voltage of a conventional ratemeter, 10 b: Diagram and time-response of a periodic integrator.

The output voltage can be used to open a gate, which allows the

passage of external pulses. In the systems of M. Rouberol (1962)

[27] and D. A. Melford (1962) [26], x-ray pulses passed through

the gate to the scanning oscilloscope, thus giving an expanded

contrast x-ray scanning.

1 . Discriminators in Lineal Analysis

In stereometric analysis an external pulse generator produces

pulses of constant frequency which pass through the gate to the

analyzing circuits. The measurement of the areal fraction of a phase

is a time measurement determining how much of the total analyzing

time the electron beam spent within the phase encountered. If, for

A H H B

c 4=- /

Sw
236 ELECTRON PROBE

example, an oscillator frequency of 100 c/s is chosen, 60,000 pulses

will be produced during 10 minutes of analysis. If, on the other hand,

a counter connected with the gate registers only 30,000 pulses

during the same analysis, it can be concluded that the electron beam

was within this particular phase 50% of the time. Therefore, 50% of

the scanned area consists of this phase. (Figure 1 1

)

ratemeter disctiminatot

lower upper

threshold

switching circuit counting circuit printer

50 c/s

oscillator

Figure 1 1. Arrangement of the "Phase Integrator".

Several parallel discriminator units can be used for the

simultaneous determination of all phases present in the alloy. In this case it is also possible to connect several discriminators with one

signal source (e.g., ratemeter) to select several concentration ranges

of one element (G. Dorfler, 1966) [14].

A further possibility is the introduction of coincidence circuits (G.

Dorfler, 1965) [24]; (K. F. J. Heinrich, 1967) [30]. In the case of

very similar phase compositions, the restriction that the conditions

for two different signal discriminators have to be fulfilled yields a

great improvement.

2. The "Inclusion Counter"

Despite the advantages of lineal analysis, the "inclusion counter"! of D. A. Melford and K. R. Whittington (1964; 1965) [22,43] shallj

be discussed in this section separately because of its veryi

sophisticated design. I This instrument uses simple discriminators and coincidence!

circuits for a very rapid determination of the grainsize distribution ofe inclusions in steel (Figure 3). Since the instrument is mainlyl—.

devoted to a rapid determination of these parameters, considerablelB

reductions in the selectivity of phases have to be admitted. Using x
DORFLER 237

ray signals, the statistical limitations mentioned in section V.A. have

to be taken into consideration. Applying scanning speeds of 500-

1000 /Mm/sec (e.g., 500 ^m line, 100 lines in 60 sec) and normal

pulse rates, only the presence or absence of elements is clearly

detectable. Therefore, Melford and Whittington used a further signal — the number of the backscattered electrons — to get a good

I selection of inclusions with low atomic number. The four signals

I (three x-ray and one atomic-number signal) are fed into

discriminators and subsequently into coincidence circuits. A

particular phase is defined by the presence or absence of several

j selected elements and by a certain atomic number. The signals,

I passing the coincidence circuits and representing the intercept

j length, are analyzed in a sizing circuit, the construction of which was

not described in the papers mentioned above. The signals obtained

from the sizing unit represent four grainsize groups of three types of

inclusions.

Provision is made that each inclusion is counted one time only to obtain the exact number of particles in the scanned area. However,

this does not seem to be necessary if the number of particles per unit

I volume is desired because this parameter is calculated from the

I distribution of the intercept length only (H. E. Exner, 1966)

[18,19], (G. Bockstiegel, 1966) [20]. All results obtained during

the analysis are stored in a binary memory and can be displayed or

printed out.

I 3. Discrimination in Point-Counting Systems

I To take full advantage of the merits of the point-count method, the

discrimination devices should be adapted to the special needs.

Point-count methods have been used for stereometric analysis by

K. Keil(1965) [32] and by P. Weinstein (1966) [23]. K. Keiluseda

manual control for the discrimination, but he pointed out that

I automation is easily possible. P. Weinstein adapted the

concentration mapping device of K. F. J. Heinrich to decide

whether or not the phase of interest is present.

: It can be seen that the great advantage of the point-count

1 technique lies in the rapid way of obtaining volume-fraction

} analyses, especially in the case of small amounts of the interesting

; phase and where only low counting rates are available. If the fixedcount method is used instead of a fixed-time measurement, it is
238 ELECTRON PROBE

much easier to preselect the maximum statistical error which can be

tolerated to discriminate the phases present accurately. A further

advantage of this method would be that the time needed for the total analysis is in many cases shorter than the time needed for lineal analysis.

The discriminator used in point-count analysis will work on a

digital basis rather than on an analog one if x-ray data are used. For

the other signals (ref. section V.), analog discrimination might be

preferable.

A measuring cycle should work approximately as outlined below.

The electron beam is set to a "starting position" on phase 1. The x- ray quanta of the selected elements for phase 1 are counted. If the

selected number of counts is reached, counting is stopped and the i time needed for the accumulation is processed into the analyzing

j circuits (discriminator or tape for computer analysis). After this, an

j "advance" signal is supplied to the step-scanning device. The f electron beam moves to the next point and the counting procedure

starts again. This should also be very useful for alloys with |' extremely varying concentrations of an element. When using lineal I' methods, the statistical accuracy will be much poorer in the low- i concentration regions than in the other ones. t

'£ C. COUNTING AND SIZING CIRCUITS (; The pulse groups or the pulses, representing intercept length or|

point counts respectively, have to be stored, counted, or analyzed ini units following the gate. The best way to discuss these units will '' probably be to divide them according to the stereometric

parameters, which are analyzed thereby. |

1 .Volume Fraction Analysis

f This is obviously the simplest way to obtain structural

parameters. In lineal analysis only the fraction of the total time o^

analysis has to be determined, during which the electron beam

remains within the selected phase (section VI.B.l.). Only one^ counter, which integrates all pulses passing the gate, is needed for this purpose.

In point-count analysis, the procedure is even simpler. If a phas^.

is recognized, one pulse has to be stored in the corresponding

counter. The ratio of the points falling within one selected phase tc

i
DORFLER 239

the total number of points scanned during the analysis gives the

areal or volume fraction of this phase.

2. Surface Areas Per Unit Volume and Mean Diameter of a Phase

As mentioned in section II. B., the surface-to-volume ratios very

often show a clear correlation to physical properties of the

investigated alloy. The measurement is also very simple. The

number of intercepts analyzed has to be registered in a separate

counter; from this number and from the length of the test line within

the particular phase, the specific surface area (Sv) and the mean

grainsize (L) of this phase can be calculated.

3. Proximity (ref. section II.D.)

The "sequence analyzer" proposed by G. Dorfler (1966) [14],

analyzes the frequency of the sequence of three or more phases

while scanning the surface along a line. The schematic diagram of

the analyzing logic is given in Figure 12. One very important feature

is that the simultaneous analysis of all phases present in a sample is possible. The working principle of the "sequence analyzer" can be

described in the following way. If channel 1 is in function, it supplies

a voltage to the bistable multivibrator (flip-flop = FF). This FF is thereby switched into its conductive state and now it supplies a

voltage to the two AND-gates 12 and 13. This is necessary because

there is no evidence at this point whether the electron beam will pass

from phase 1 into phase 2 or into phase 3. Now, if the beam comes

! into phase 2, channel 2 starts and supplies a voltage to FF 2 and this,

I in turn, to the AND-gates 12 and 13. Channel 1 has stopped

operation, but due to its electronic characteristics, the FF 1 still supplies the voltage to the AND-gates 12 and 13. By this way, only

the AND-gate 12 obtains voltages at both branches and can now

switch the counter 12 to the next number. The two remaining gates

13 and 23 are inactive because only one branch of each obtains a

' voltage. After the advance (1 number), the counter supplies a reset

signal to the FF's 1 and 2; both are switched to the nonconductive

state. Since channel 2 still supplies a voltage to FF 2, the same

procedure starts again: FF 2 is transferred into the conductive state and the sequence analyzer is ready to register the next sequence. A

voltage diagram is given in Figure 13. Since only electronic devices are used, speed limitations lie mainly in the signal generators.
240 ELECTRON PROBE

12' 23'

1r

13'

Figure 1 2. Arrangement of the "Sequence Analyzer": 1,2,3 = analyzing circuits) r, 2', 3" = Flip-flops; 12, 13,23 = AND-gates; 12', 1 3', 23' = counters.

4. Grainsize Distributions and Number ofParticles Per Unit

Volume

These two stereometric parameters require the most sophisticatecj

analyzing circuits, as can be seen from the "inclusion counter" of D

A. Melford and K. R. Whittington (1964, 1965) [22,43] (ref. to section VLB.2.)- i According to the experience gained in light microscopy (H. E|j

Exner, 1966) [18,19]; (G. Bockstiegel, 1966) [20], it seems to b

most expedient to obtain an "oversize distribution", which can b
DORFLER 241

2'

12

'2

12'

^ '2

Figure 1 3. Voltage diagram, showing the principle of the "Sequence Analyzer".

converted to size distributions in space. The length intervals, which

are covered by the size classes, have to be chosen according to the

problem. Normally 1 to 15 classes are sufficient, which can be

divided in a logarithmically-equidistant way (Exner, 1966) [18].

iThe intercept lengths are registered in the "integral method"; that means that all intercepts which are smaller than the upper limit of a

given class are summed up in this class. This method has several
242 ELECTRON PROBE

considerable advantages. The comparison of several distributions is ' much easier than by the "histogram method", where the number of

j lengths falling within a class are counted separately.

| From the same results, the number of particles per unit volume

j can also be determined (H. E. Exner, 1966) [18]; (G. Bockstiegel,

1966) [20]. I

D. DATA REDUCTION AND ANALYSIS WITH A DIGITAL

COMPUTER

j The most promising possibility seems to be the application of the | digital computer for handling the great amount of data obtained i during one analysis. A great deal of work has been done in the field j of light microscopy, where the digital computer has been | successfully applied by G. A. Moore (1964, 1966) [44,45].

j Here some possibilities shall be discussed, which are presently

under investigation in our laboratory. One great problem is the fact '

that our present analyzing systems are far too slow for a direct data

j transfer to the computer. Magnetic tape or paper tape has to be used

^ as a storage device. It is very important that no information be lost , during the storage and transfer process. One example may illustrate 1 this. If all pulse groups (= intercept length) are integrated on a

'. counter, information is no longer available concerning the other

^ parameters such as grainsize, grainsize distribution, etc. The i optimum would be to store all pulse groups for all phases without | alteration of their relative position, their sequence and their position on subsequent lines. Under these circumstances, the most

preferable device will be a magnetic-tape recorder, which can

register relatively high pulse frequencies; this may be a multiple

track recorder which is computer-compatible or, as in our

laboratory, a normal tape recorder with some special modifications. ^ Figure 14 shows the arrangement diagrammatically. The pulses of|

four channels are recorded on one track and are distinguished by[

their amplitudes. If all phases are analyzed simultaneously and the! conditions are optimal, a continuous chain of pulses should exist, the|

amplitude of which changes with the sequence of the phases. Thej^

end of a scanning line can be indicated on a separate track to allow^ more sophisticated evaluations, which will be discussed at a later, time.
DORFLER 243

gates

incremental binary

tape-recorder 1=5 m =? n:6 iv:4 n =5 counting

(computer- and coding

compatible) , , , unit

I

I coded pulse-groups I — 1

Figure 14. Arrangement for the computer evaluation of the data, supplied by the phase integrator.

The analysis can be recorded on the tape at relatively low speed

while the playback may be much faster. Now the pulse groups of the

I individual phases have to be transferred onto magnetic tape; in this

' way, a first data reduction can be accomplished: the individual pulse

i groups are sorted according to their amplitude by means of

I discriminator circuits (Figure 14) and are fed into counting circuits.

i The counting circuit of each phase adds the pulses of each pulse

group and transfers it to the incremental tape recorder of the

pomputer, simultaneously indicating the channel from which the
244 ELECTRON PROBE

pulse group came. Thus, one scanning line may perhaps look like A

16, B 25, A 2, C 30, B 12, etc., (the letters mean phase type and

numbers mean number of pulses (or microns).

If this tape is processed in the computer, applying an appropriate

program, practically all stereometric parameters can be evaluated.

The great advantage of this system will be that the computer can

perform even very elaborate calculations involved in the

determination of grainsize distributions of complex particles.

Furthermore, error calculations, as they are described briefly in section VIII., can be performed more accurately.

The use of the digital computer for this purpose is a very new field and some experience should be gained. Certainly much of the work

done by G. A. Moore (1963; 1964; 1966) [44-47] can be applied to these purposes.

VII. Analyzing Conditions

If the conditions of a stereometric analysis are discussed, a compromise between the maximum speed and the maximum error which can be tolerated has to be made. Therefore, it is necessary to discuss these two questions in one section. We have the following

variables involved in the analysis:

the electron beam diameter

the time constant of the ratemeter

the threshold setting and

the scanning velocity

A. INFLUENCE OF THE BEAM DIAMETER

i If there is a concentration discontinuity between two phases, thel

finite beam diameter will cause an observed concentration;

distribution, as illustrated in Figure 15. This function depends only| on the geometry of the arrangement and not on the scanning,

velocity. Therefore, in stereometric analysis the beam diameterl

should be chosen as small as possible. More precisely it should be|

noted that an "x-ray emission diameter" rather than the beamf

diameter causes the above mentioned distribution curve. f

B. THE TIME CONSTANT OF THE RATEMETER AND THE PULSE- : INTEGRATOR

Both these digital-to-analog converters have been discussed ini( detail in section VI. A.; therefore, reference can be made to this, section. i
DORFLER 245

Phase boundary

(jpigure 15. Influence of the finite beam diameter on the voltage supplied by the ratemeter (time constant is assumed to be negligible).

C. INFLUENCE OF THE SCANNING VELOCITY

Since the time constant of the ratemeter and the scanning

rlvelocity are functions of time, both are strongly interrelated. If a

discontinuity in the concentration is assumed, the electron beam
246 ELECTRON PROBE

will travel some distance away from this discontinuity before the

maximum value of the ratemeter output is obtained. For a

quantitative length measurement, it is absolutely necessary that the

effective signal value be reached before the electron beam leaves the

phase again. Otherwise the threshold setting would depend on the

grainsize of the phase.

D. INFLUENCE OF THE THRESHOLD SETTING

A simple consideration shows that the voltage change at thej ratemeter must obey the same laws at the entrance into a phase and

when leaving a phase. A "critical intercept length" can be

calculated, at which the maximum value of the signal is reached

just before the beam leaves the phase. Figure 16 shows several; voltage changes for different conditions. The shape of the curve i was obtained from the overlapping of the ratemeter- and the beam

size function. Oscillograms show that these assumptions are valid

j

(K. F. J. Heinrich, private communication). i Due to the shape of this voltage curve it can be easily concluded'

that a correct discrimination can only be made at the 50% value' between minimum and maximum. |

I Count Rate (%) ;

/ /

/ /

/ /

\

\

/ / 1 /

\

\

1 /

1 /

\

\

\

\

\

•I

Figure 1 6. True voltage variation obtained by passing over a phase of critical siz^; (the 100% value is just attained). I
DORFLER 247

E. THE SCANNING VELOCITY

This variable has already been included in Figure 1 6. It influences

the spatial resolution of the measurement very strongly. A simple

[ calculation shows that four times the time constant (4cr) has to

I elapse before the ratemeter voltage reaches 99% of the signal value.

' Therefore, the distance covered by the electron beam during 4cr

i gives the spatial resolution of the method, provided that the electron

I beam is smaller than this size.

I Figure 17 gives the interrelation between spatial resolution and

I scanning velocity plus beam size.

i The application of the periodic pulse integrator as a signal source

' should give a considerable improvement in these cases.

Figure 1 7. Lateral resolution obtained by scanning analysis ED = beam diameter;

T = time constant.

VIII. Experimental Errors

Errors in the length measurement can be involved in two ways.

On one hand, the threshold settings may not be correct and the

spatial resolution may not be sufficient; on the other hand, x-ray

statistics may not be good enough to allow an accurate identification

of the phase. The errors caused by lack of resolution and poor

statistics can be easily avoided and will not be treated here.
248 ELECTRON PROBE

A. ERRORS DUE TO THE THRESHOLD SETTINGS

If the settings of the thresholds are correct, no error should be I involved in the analysis. However if more than two phases are ' present, it will be quite difficult to define where the 50%

discrimination has to be set (e.g., the measured phase contains 50%

of an element, the phases surrounding it contain 20% and 5%1

respectively). , Another effect which may cause errors in the threshold settings^! can be drift of the probe current — which could be avoided if the! pulse rate/beam-current ratio is used. \ For the following discussion, an error in the threshold setting of|

50 ± 10% (± 20% rel.) has been assumed. The deviation in micronsi

from the true value has been measured on Figure 16. Figure 18 gives the relative error depending on the experimental

conditions and the mean grainsize.

Experimental

Error (%)

Figure 1 8. Experimental error in the length measurement as a function of meai

grainsize (d) and the analyzing conditions:

'

1 = scan 1 /x/s; beam = lyu,, t = 0. 1 s i 2 = scan 5/x/s; beam = l^i, t = 0. 1 s

| 3 = scan lO/x/s; beam = Iju,, t = 0.1 s I 4 = scan 8.3/ix/s; beam = 3jU,, T = 0.1 s i.
DORFLER 249

B. STATISTICAL ERRORS IN THE ESTIMATION OF VOLUME

COMPOSITION FROM DATA OBTAINED ON A SURFACE

These errors have been treated very extensively by S. A.

Sahykov (1958) [9] and can be discussed here only very briefly.

It has been shown by the aforementioned author that the expected

standard deviation can only be evaluated experimentally. It depends on the areal fraction of the phase analyzed, the number of

intersections measured, and a shape coefficient.

The tables 3 and 4 give the absolute errors of the volume fraction

analysis for two confidence limits (50% and 95.4% respectively).

Both have been calculated by Saltykov for a shape coefficient K= 1. This, however, is the most unlikely possibility. For an isotropic

distribution, K = 0.65; for an oriented distribution with

measurements normal to the orientation, K = 0.34. According to the

formula given in Tables 3-4, the measured number of intercepts has

to be divided by to give the corrected number of intersections

used in Tables 3 and 4. In Figure 19, the dependence of the statistical error on the

number of intersections and the areal fraction of the phase is shown.

Statistica

Error (%) t 50

40

30

20

10

100 —I200 300 400

Number of Intercepts (counts)

Figure 19. Statistical error, introduced by the conclusion from the surface to the volume.

295-798 0-68— 17
250 ELECTRON PROBE

Table 3

Volume % of phase

A

1 2 3 4 5 10 15 20 25 30 35 40 45

50 99 98 97 96 95 90 85 80 75 70 65 60 55

10 2. 10 2.96 3.60 4.14 4.60 6.33 7.53 8.44 9.13 9.65 10.05 10.31 10.48 10.52

20 1.48 2.08 2.54 2.92 3.25 4.47 5.32 5.96 6.46 6.83 7.11 7.30 7.41 7.45

50 0.94 1.32 1.61 1.85 2.06 2.83 3.36 3.77 4.08 4.32 4.49 4.61 4.69 4.71

100 0.66 0.93 1.14 1.31 1.45 2.00 2.38 2.57 2.89 3.06 3.18 3.27 3,32 3.33

200 0.47 0.66 0.80 0.92 1.03 1.41 1.68 1.88 2.04 2.16 2.25 2.31 2.34 2.36

300 0.38 0.54 0.66 0.75 0.84 1.15 1.37 1.54 1.67 1.76 1.83 1.88 1:91 1.92

400 0.33 0.47 0.57 0.65 0.73 1.00 1.19 1.33 1.44 1.53 1.59 1.63 1.66 1.67

500 0.30 0.42 0.51 0.58 0.65 0.89 1.06 1.19 1.29 1.36 1.42 1.46 1.48 1.49

600 0.27 0.38 0.46 0.53 0.59 0.82 0.97 1.09 1.18 1.25 1.30 1.33 1.35 1.36 1

700 0.25 0.35 0.43 0.49 0.55 0.76 0.90 1.01 1.09 1.15 1.20 1.23 1.25 1.26

800 0.23 0.33 0.40 0.46 0.51 0.71 0.84 0.94 1.02 1.08 1.12 1.15 1.17 1.18

900 0.22 0.31 0.38 0.44 0.48 0.67 0.79 0.89 0.96 1.02 1.06 1.09 1.11 1.11

i 1000 0.21 0.30 0.36 0.41 0.46 0.63 0.75 0.81 0.91 0.97 1.00 1.03 1.05 1.05

f 2000 0.15 0.21 0.25 0.29 0.32 0.45 0.53 0.60 0.65 0.68 0.71 0.73 0.74 0.74

f 3000 0.12 0.17 0.21 0.24 0.27 0.37 0.43 0.49 0.53 0.56 0.58 0.60 0.61 0.61

^ 4000 0.10 0.15 0.18 0.21 0.23 0.32 0.38 0.42 0.46 0.48 0.50 0.52 0.52 0.53 f

5000 0.09 0.13 0.16 0.18 0.21 0.28 0.34 0.38 0.41 0.43 0.45 0.46 0.47 0.47 E

10000 0.07 0.09 0.11 0.13 0,15 0.20 0 24 0.27 0.29 0.31 0.32 0.33 0.33 0.33

1'

15000 0.05 0.08 0.09 O.ll 0.12 0.16 0.19 0.22 0.24 0.25 0.26 0.27 0.27 0.27?'

20000 0.05 0.07 0.08 0.09 0.10 0.14 0.17 0.19 0.20 0.22 0.22 0.23 0.23 0.24?

25000 0.04 0.06 0.07 0.08 0.09 0.13 0.15 0.17 0.18 0.19 0.20 0.21 0.21 0.21-

30000 0.04 0.05 0.07 0.08 0.08 0.12 0.14 0.15 0.17 0.18 0.18 0.19 0.19 0.19'

40000 0.03 0.05 0.06 0.07 0.07 0.10 0.12 0.13 0.14 0.15 0.16 0.16 0.17 0.17f 50000 0.03 0.04 0.05 0.06 0.06 0.09 0.11 0.12 0.13 0.14 0.14 0.15 0,15 0.151.

100000 0.02 0.03 0.04 0.04 0.05 0.06 0.08 0.08 0.09 0.10 0.10 0.10 0.10 o.ii;

A - Number of intersections (counts)

Reliability = 50%

C. THE TOTAL EXPERIMENTAL ERROR

The total error can be calculated easily from the sources mentioned in VIII. A. and VIII. B., assuming a normal erro; propagation (P app + stat = P total). This dependence is given ii
DORFLER 251

Table 4

Volume % of Phase

. 0 1 2 3 4 5 10 15 20 25 30 35 40 45

,() 100 99 98 97 96 95 90 85 80 75 70 65 60 55

I 50— _ — - — — — — - — — — 13.83 14.07 14.13

100 _ _ _ _ — — — 7.14 8.00 8.67 9.18 9.54 9.81 9.96 10.00

200 —— — — — — 4.23 5.04 5.64 6.12 6.48 6.75 6.93 7.02 7.08

300 — — — — — 2.52 3.45 4.11 4.62 5.00 5.28 5.49 5.64 5.73 5.76

400 — — — — 1.95 2.19 3.00 3.57 4.00 4.32 4.59 4.77 4.89 4.98 5.00

I 500 — — — 1.53 1.74 1.95 2.67 3.18 3.57 3.87 4.08 4.26 4.38 4.44 4.47

1 600 — - 1.14 1.38 1.59 1.77 2.46 2.9 1 3.27 3.54 3.75 3.90 4.00 4.05 4.08

j 700 — — 1.05 1.29 1.47 1.65 2.28 2.70 3.03 3.27 3.45 3.60 3.69 3.75 3.78

I 800 — — 1.00 1.20 1.38 1.53 2.13 2.52 2.82 3.06 3.24 3.36 3.45 3.51 3.54

I 900 — — 0.93 1.14 1.32 1.44 2.00 2.37 2.67 2.88 3.06 3.18 3.27 3.33 3.33

1000 — — 0.90 1.08 1.23 1.38 1.89 2.25 2.52 2.73 2.91 3.00 3.09 3.15 3.15

2000 — 0.45 0.63 0.75 0.87 0.96 1.35 1.59 1.80 1.95 2.04 2.13 2.19 2.22 2.22

I 3000 — 0.36 0.51 0.63 0.72 0.81 1.11 1.29 1.47 1.59 1.68 1.74 1.80 1.83 1.83

I 4000 — 0.30 0.45 0.54 0.63 0.69 0.96 1.14 1.26 1.38 1.44 1.50 1.56 1.56 1.59

' 5000 — 0.27 0.39 0.48 0.54 0.63 0.84 1.02 1.14 1.23 1.29 1.35 1.38 1.41 1.41

' 10000 — 0.21 0.27 0.33 0.39 0.45 0.60 0.72 0.81 0.87 0.93 0.96 0.99 1.00 1.00

15000 — 0.15 0.24 0.27 0.33 0.36 0.48 0.57 0.66 0.72 0.75 0.78 0.80 0.81 0.81

20000 — 0.15 0.21 0.24 0.27 0.30 0.42 0.51 0.57 0.60 0.66 0.66 0.69 0.69 0.72

25000 — 0.12 0.18 0.21 0.24 0.27 0.39 0.45 0.51 0.54 0.57 0.60 0.63 0.63 0.63

30000 — 0.12 0.15 0.21 0.24 0.24 0.36 0.42 0.45 0.51 0.54 0.54 0.57 0.57 0.57

40000 — 0.09 0.15 0.18 0.21 0.21 0.30 0.36 0.39 0.42 0.45 0.48 0.48 0.51 0.51

50000 — 0.09 0.12 0.15 0.18 0.18 0.27 0.33 0.36 0.39 0.42 0.42 0.45 0.45 0.45 - 0.06 0.09 0.12 0.12 0.15 0.18 0.24 0.24 0.27 0.30 0.30 0.30 0.31 0.33

- Number of intersections (counts)

eliability = 95.44%

igure 20. From the Figure it can be concluded that a low

sxperimental error can be achieved only if the error of the analysis

IS well as the statistical error is small. Therefore, an accumulation of

I great many data points (intersections, point counts) is in most

;ases far more important than a very small error caused by the

ipparatus.
252 ELECTRON PROBE

0 10 20 30 40 ^ % Statistical Error

j

I Figure 20. Total error of the analysis. >

IX. Applications (Examples and further possibilities)

Because of the short time during which the instruments discussed

have been available, all the application possibilities have not been

completely explored (not very many applications have beenj'

published). In this section it shall be mainly pointed out where the{

applications of the microprobe as a signal generator seem to be

useful and where very interesting results may be expected. In the; majority of the already published examples, the volume fractions or phases have been of primary interest. f

A. VOLUME FRACTION ANALYSIS [

I

K. Keil (1965) [32] used the point-count method (ref. sectioij

VLB.3.) to perform a mineralogical modal analysis {— stereometric

analysis) on meteorite specimens.

| J. M. Ramsey and P. Weinstein (1966) [43] performed a linea

analysis by means of the instrument mentioned in section III oi 10/90 tin-lead samples with various gold additions. The areas usee for the analysis were 340 /a square and three areas were analyzed oi each sample. The results of these measurements are given in Figur

21.
DORFLER 253

012 345678 I %Au ADDED TO 10/90

• Sn-Pb SOLDER

Figure 21. Example of lineal analysis by the electron probe (Ramsey and

Weinstein, 1966).

.j Several results have been published by G. Dorfler (1965; 1966;

1 1967) [14,15,24,49-52]. Some interesting results shall be discussed

here. A very important and sometimes difficult problem is the

determination of the ferrite and austenite volume fractions in high

grade steels. Since the ferrite content strongly influences the

resistance against corrosion and the mechanical properties, an

accurate method for the determination would be advantageous.

In light-microscopy two major problems arise. On the one hand,

manual integration methods are by far too tedious to be generally

applicable; on the other hand, automation by means of a television

microscope is nearly impossible because of the faint contrast between ferrite and austenite, if normal etchants are applied. The

reliability of the results by other physical methods for this
254 ELECTRON PROBE

determination (e.g., the magnetic balance and x-ray diffraction

methods) suffer from the influence of inhomogeneities. However, if the electron probe and the phase integrator are used (G. Dorfler,

1965; 1966), ferrite and austenite can be discriminated by means of

their different Ni-contents (in high grade steels), and influences of

inhomogeneities can be excluded up to a certain degree. Table 5 | gives the results of a considerable number of analyses which have

been compared with light microscopy. The indicated errors have

been calculated according to the procedures discussed in section

j VIII. The standard deviation is much lower if repetitive

measurements on the same area are performed; however, in

practice, only the total error of the volume-fraction analysis is of

interest. Two problems have been investigated in iron meteorites i concerning some interrelations between phosphides and the||

Widmanstatten structure. Measurements of the volume fraction of' kamacite (a-phase), taenite (ju,-phase), and schreibersite (phosphide) J have been performed in a great number of so-called plessite fields.

Figure 22 gives the relationship which has been found. The results

show a clear increase of a-phase with increasing phosphide content

| (G. Dorfler, 1966; 1967) [14,52]. :i In the latter investigation (G. Dorfler, 1966) [14] another;

possible application of stereometric techniques is shown. In most}

kinetic considerations, the distribution of the various phases is of|

great interest. Here, the phosphide distribution relative to the] Widmanstatten structure has been determined. The distance'

between two taenite-lamellae in the kamacite has been divided into

100% (Figure 23 a) and a great number of such structures have beenj

scanned in small increments, with the volume fraction of phosphides

being measured in each increment. The result of all measurements is given in Figure 23 b, and it is clearly shown that a grain-boundary!

nucleation of the phosphides takes place. |

Perhaps one of the most promising possibilities of the electron' microprobe in stereometric analysis lies in the quantitative

structural measurements on segregated materials. In this field,' practically no other methods are applicable, while the microprob^

permits the collection of very accurate results. J. Philibert and his group (J. Philibert et al. 1959) [53]; (C. Crussard et al. 1959) [54]

developed a method for characterizing segregations of certair elements in steel by the ratio of the maximum to the minimum to th( i
DORFLER 255

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256 ELECTRON PROBE

0 1.0 2.0 3.0

Vol % FegP

Figure 22. Dependence of the til(a+ fi) ratio on the amount of phosphides in metallic meteorites (Dorfler, 1967) [52].

concentration of the encountered element and by the mean distance

of the segregations. However, not only these parameters but also the

frequency of segregation peaks and minima have certainly a great J influence on the physical properties of a material. G. Dorfler, E. i. Plockinger, and K. Swoboda (1966) [15] investigated the annealing

kinetics of an Fe-Ni-P alloy containing 12% Ni and 0.5% P. The

segregations observed in a line scan can be seen in Figure 24. Four
DORFLER 257

w

a \\ a

("/„ DISTANCE) \ \

vV W (a)

Figure 23. Quantitative determination of the phosphide distribution between fi- piates in iron meteorites; 23a: schematic stcetch how to divide the distance between two /lA-plates into 100%, 23b: distribution of phosphides between (jl- piates.

concentration ranges (I-IV) have been selected by the threshold

settings, and the volume fractions of the alloy falling within these

limits have been measured.

Since annealing at 1300 °C should bring the alloy into the one- phase field, the P-concentration of the whole alloy should lie within

the limits of range II (0.33 - 0.66% P), thus giving 100% (vol).

Figure 25 shows the results for increasing annealing times. The

measurement gives quite a good indication of the kinetic reaction

process.
258 ELECTRON PROBE

15.0

Phosphide

f 2.0-

1.0

0.5

!

1

tlia

10 20 30 40 50

Trace line, in //m

60 70 80

Figure 24. Phosphorus segregation in an as-cast Fe-Ni-P alloy (12% Ni, 0.5% P): '

I: Channel I « 0.33% P); 11: Channel II (0.33-0.66% P); III: Channel 111 (0.66-1 2.22% P); IV: Channel IV ( > 2.22% P), for the "Phase Integrator". |

B. DETERMINATION OF THE MEAN DIAMETER OF PHASES

j Measurements of this parameter have been made by R. Theisenj

(1964) [21]. He investigated the structural characteristics of FeAlsi

inclusions in SAP (sintered aluminium powder). The spectrometer; was set to the FeK radiation and the sample was scanned!

mechanically 100 x 100 m^. During the scan, all Fe impulses were! recorded; a modified recorder equipped with an electro-mechanical'
DORFLER 259

100

90

80

70

: 60

IL60

\ 40

30

20

10

0

V

^^-^—X

VN —

200 300 SOO 1000

Duration of heating (in sec)

5000 10000

Figure 25. Annealing kinetics of the alloy mentioned in Fig. 24.

counter registered the number of particles intersected. The mean

diameter of the FeAla particles can be calculated from the formula:

d = n = number of intersections

_ N(Fe)-10^U

^ ~~Kn ^Tr N(/re)= number of counts on Fe K

during 20 minutes on pure iron

(scanning 10^ microns)

N(Ve) = number of counts on Fe K

during 0. 1 2 sec (= 1 /x at that scanning velocity)

U = background counts on Fe K

during 0. 1 2 seconds, measured

on SAP
260 ELECTRON PROBE

The mass-concentration of the inclusions can be determined by \

i the formula:

C C 1 = ratio of counts on Fe K between

pure iron and SAP surface while

scanning 10^ microns

C2 = ratio of the intensities on Fe K

between pure iron and FeAU,

measured with a static probe

The results of the experiments are given in Figure 26.

1.5

_« 1.1 <:

0.7

0.3

1

1

—

Q

4

ri

X

600

440

280

120

a.

a>

0 20 40 60 80

Diameter reduction (in %)

Figure 26. Influence of degree of deformation on mean diameter and number of

FeAl.i inclusions in SAP-ISM L (7% AI-0,)(Theisen, 1964) [21].

'

I C. GRAINSIZE DISTRIBUTIONS } The only measurements to the knowledge of the author have been*

performed by D. A. Melford and K. R. Whittington (1964, 1965)^

[22,43], using their inclusion counter; the instrument has been,^

discussed in section VLB.2. Unfortunately, results have not been!^ available to the author. They will be published in the paper of E. A

Melford and K. R. Whittington (1965) [43].

D. FURTHER APPLICATION

It is believed that the large field of application of structura

investigations with the microprobe lies in the experimental regiorf

where light microscopy cannot be applied at all or only with very

I
DORFLER 261

' great difficulties. This would then include most of the multiphase

I alloy systems, where the differences between the phases present are

] normally too small to be measured or to be used for an exact

j discrimination. Therefore, etching and staining methods have to be

I used and must be applied very carefully to give reliable results.

! However, even with these methods, compositional ranges of phases

I (e.g., carbides, oxides, sulfides, etc.), segregations, and

{ inhomogeneities cannot be measured stereometrically by light

microscopy.

Since the probe permits the determination of the chemical

composition of microvolumes, it is certainly the best signal

I generator for a stereometric determination. It should always be kept

j in mind that chemical reactions form the microstructure to be

! investigated and that chemical differences between phases are in

I most cases much more meaningful than changes in optical

reflectivity. No enumeration of possibilities for application need be

given; only few suggestions for very interesting experiments will be

made below.

I Much effort has been made to obtain a good characterization of

the homogeneity of alloys, and especially of standards (H. Yakowitz

.et al. 1965; H. Yakowitz et al. 1966) [55,56]. Stereometric methods

in combination with the electron probe seem to be a very useful

I approach to this problem. As was pointed out in section VLB. 3., the

point-count method will permit stereometric measurements even if only small segregations exist or the segregating element is present

only in very low concentrations. An experiment might be performed

jas follows: some randomly distributed points are measured

! quantitatively for the elements encountered on the selected sample.

Information is thereby gained about the concentration- and pulseirate levels of these elements. According to the metallurgical or

(technological problem, appropriate "discrimination channels" are

(Selected. If 0.5% of a certain element is present, the concentration

, ranges for the measurement could be:

range I: < 0.33%

range II: 0.33-0.45%

range III: 0.45-0.55%

range IV: 0.55-0.67%

1 range V: > 0.67%

1 These limits have been chosen according to the {Cmaximumlcmimmum)

/ranges which could be of interest. The limits of range I and V
262 ELECTRON PROBE

represent a Cmaxicmin of 2, whereas all segregations which are smaller than 1.2 will be registered in channel III. Channels II and

IV represent medium segregations. If the coefficient of variation in the measurement should be not more than 10% (rel.), at least 100

counts have to be accumulated on each point. Therefore, the time

needed for the accumulation of these 100 counts will be used for the

discrimination; if a pulse rate of 10 c/s on 0.5% of this element is assumed, this would give the following scheme:

seconds (for 100 counts) channel

> 15 I 15.0-10.5 II 10.5 - 9.5 III 9.5 - 7.5 IV

< 7.5 V

This means that, for an accumulation of 100 data points,

approximately 17 minutes will be needed. If a higher counting rate I can be obtained, the time will be shorter. The distance between the | points can be selected according to the mean distance of the

segregations. For good statistical accuracy, approximately 1000

points should be analyzed. This means a total time of analysis of

approximately 3 hours. To avoid drift problems, the x-ray count/beam-current ratio could be used.

By this method, the homogeneity of large areas of a sample could

be tested quite accurately. Moreover, the kinetics of the

homogenization can be measured as has been shown in Figure 24. While in the as-cast alloy, great amounts of the volume will be ; registered in ranges I, II, IV and V, the whole alloy should be within

range III if the homogenization has succeeded. It should be kept in \ mind that the distribution of several elements can be measured

simultaneously.

X. Conclusions and Suggestions

The methods for the quantitative evaluation of microstructures

have been introduced into microprobe research only recently;

therefore, only relatively few applications have been published to date.
DORFLER 263

Stereometric methods in combination with the electron

I microprobe seem to open a new dimension in microprobe research.

I In former times, scanning pictures have been considered only in a

' qualitative way. Now these methods allow a quantitative evaluation

of the spatial distribution of phases or concentration ranges. Great

emphasis should be laid on the fact that the signals of the probe,

Micrograph X-ray Scanning

(expanded contrast Ni)

Austenite Ferrite

i -t

100 ^, Figure 27. Example of the representation of phases by means of "phase images".

The Ni-concentrations used for discrimination were 8% in the ferrite and 12%

in the austenite (Dorfler and Plockinger, 1 966).
264 ELECTRON PROBE

obtained during the scanning process, are analyzed directly — with no intermediate image formation. Of course, a "phase picture" can be formed simultaneously with the analyzing process. In Figure 27,

the ferrite/austenite distribution in a high grade steel is shown.

In the future, these methods may help to gain considerably more

insight into solid state reactions by using structural parameters

which show direct correlation to the physical and chemical

properties of the material investigated.

Much work should be done in the near future to develop an "ideal

instrument" for stereometric analysis, which should enable the

operator to perform rapid and automatic structural analysis. Some

fields in which discussions and further developments should be

stimulated are:

A. IMPROVEMENT OF THE SIGNAL DETECTORS

As pointed out in section V., the emphasis lies mainly on a very

sensitive signal, which makes possible an accurate discrimination

between the phases present. In most cases, a high sensitivity is much more important than the possibility of obtaining quantitative

results. Nondispersive x-ray detectors and solid-state x-ray detectors seem to be highly favorable. As many elements as desired

may be measured simultaneously by means of several single channel

analyzers. The target current amplifiers should be improved so that the detection of 0. 1 of the mean atomic number is easily possible.

This may be accomplished by using the "stereo monitor" to avoid

topography effects and by measuring the ratio of the target current

to the beam current to become independent of drift problems.

Other signal sources, such as the secondary electron emission and

cathodoluminescence, should be used more extensively to obtain

signal differences between the phases encountered.

B. IMPROVEMENTS OF THE X-RAY INTEGRATORS

The new "periodic pulse integrator", designed by K. F. J. Heinrich (1964) [34], has been discussed in section VI. A. It will|

bring considerable improvement in the spatial resolution of thef

method. For stereometric analyses, the integrating time should be

adjustable within a wide range (1 msec — 1 sec); the integration time

is selected according to the counting rate, the scanning velocity, andi

the statistics necessary for the discrimination.
DORFLER 265

C. ANALYZING CIRCUITS

Possibilities should be provided that lineal analysis, as well as point count analysis, can be performed with the same instrument.

Therefore, partially different analyzing circuits for both methods

should be incorporated.

Furthermore, the analyzing circuits (including the discriminators)

should be capable for a "working speed" up to approximately 100 kc

for a rapid analysis by means of the target current or the

cathodoluminescence; a complete analysis by means of these signals

could be performed in less than 30 seconds. According to these

demands, the oscillator frequency has to be adjustable between 50

c/s and 100 kc/s. The possibility of transferring the data (intercept

length or point counts) onto tape has been discussed in section

VI.D.

It can be concluded that the great advantage of the system

discussed above lies in the fact that large amounts of stereometric

data can be collected in an objective way. The setting of the

thresholds can be determined quantitatively by measuring the signal

values on the encountered phases; therefore, no biased results are possible if the measurements are performed accurately.

Furthermore, selective analyses are possible on phases and samples

where optical methods are without any success. If these methods

are combined in a suitable way with computer evaluation, numerous

alloys could be investigated in order to obtain a quantitative

description of the chemical and the structural composition of solid

materials. As a consequence, a clear correlation between structure,

chemistry, and physical properties should be observable which may

lead to the programmed development of new materials.

It is hoped that this paper will stimulate some discussion and

further development and that it will help in this way to reach this target within a short time.

XI. References

[1] Fischmeister, H. F., Prakt. Metallogr. 2, 25 1-263 (1966).

[2] Exner, H.E., and Fischmeister, H.F.. Prakt. Metallogr. 3, 18-26(1966).

[3] Duncumb, P., and Cosslett, V. E., X-Ray Microscopy and X-Ray

Microanalysis (Academic Press, New York), (1956) pp. 374-380.

[4] Rozival, A., Bull. Geol. Soc. Amer. 14, 466 (1903).

[5] Heyn, E., Metallographist 6, 37 (1903).

[6] Scheil, E., Z. Metallk. 27, 199 (1935).

295-798 0-68— 18
266 ELECTRON PROBE

[7] Scheil, E., and Wurst, H., Z. Metallk. 28, 340-343 (1936).

[8] Smith, C. S., and Guttman, L., Trans AIME 197, 81 (1953).

[9] Saltykov, S. A., "Stereometric Metallography" (Russian) Metallurgizdat

Moscow (1958). [10] Hiiliard, J. E., and Cahn, J. W., Trans AIME 221, 344-352 ( 196 1 ). [ll] Elias, H., and Weibel, E., eds., "Quantitative Methods in Morphology"

(Springer Veriag, Heidelberg) (1967). [12] Underwood, E., "Quantitative Stereology" to be published (Addison-Wesley,

Cambridge, Mass.) (1967).

[ 13] Henning, A., Zeiss Werkszeitschr. 6, 78 (1958). [14] Dorfler, G., Thesis; University of Vienna (1966). [15] Dorfler, G., Report at the Congress "Progress in Metallography" Leoben,

Austria (1966), Radex Rundschau 3/4, 781-785 (1967). [16] DeHoff, R. T., Trans AIME 224, 474-477 (1962). [17] DeHoff, R. T., Trans AIME 233, 25-29 (1965). [18] Exner.H. E., Prakt. Metallogr. 3, 334 (1966). [19] Exner.H. E.,Z. Metallk. 57, 755-764 (1966). [20] Bockstiegel,G.,Z. Metallk. 57, 647 (1966). [21] Theisen, R.,Z. Metallk. 55, 128-134(1964).

[22] Melford, D. A., and Whittington, K. R., Metallurgia 70, 49-51 (1964). [23] Weinstein, P., Master's Thesis, Polytechn. Inst., Brooklyn, New York (1965). [24] Dorfler, G., Arch. Eisenhuttenwes. 36, 649-653 (1965). [25] Heinrich, K. P. J., Advances in X-Ray Analysis Vol. 6 (Plenum Press, New

York), (1962) p. 291.

[26] Melford, D. A., J. Inst. Metals 50, 2 17-223 ( 1962). [27] Rouberol, M., et al., Mem. Sci. Rev. Met. 59, 305 (1962). [28] Heinrich, K.F. J., NBS Tech. Note 401 (1966). [29] von Ardenne, M., Z. Techn. Phys. 19, 407 ( 1 938). [30] Heinrich, K. P. J., NBS Tech. Note 278 (1967). [31] Birks, L. S., and Batt, A. P., Anal. Chem. 35, 778-782 (1963). [32] Keil, K., Am. Miner. 50, 2089-2092 (1965). [33] Park, P. R., et al., Geochim. et Cosmochim. Acta 30, 399-414 (1966). [34] Heinrich, K. P. J., Advances in X-Ray Analysis Vol. 7 (Plenum Press, New

York), (1964) pp. 383-394.

[35] Malissa. H., Elektronenstrahl-Mikroanalyse (Springer Veriag Wien-New

York) (1966). [36] Duncumb, P., X-Ray Optics and X-Ray Microanalysis (Academic Press, New

York), (1963) pp. 43 1-439. [37] Weinryb, E., These, Paculte des Sciences de I'Universit^ de Paris. [38] Heinrich, K. P. J., Advances in X-Ray Analysis Vol. 7 (Plenum Press, New

York), (1964) pp. 325-340.

[39] Kimoto, S., and Hashimoto, H., The Electron Microprobe, McKinley et al. (ed.) (J. Wiley Sons, New York), (1966) pp. 480-489. '

[40] Keil, K., Portschr. Miner. 44 (1), 4-66 (1966). [41] Wittry, D. B., and Kyser, D. P., J. Appl. Phys. 35, 2439 (1964). [42] Kyser, D., and Wittry, D., The Electron Microprobe (1966), pp. 691-714.

[43] Melford, D. A., and Whittington, K. R., X-Ray Optics and X-Ray

Microanalysis (Hermann, Paris, 1966) (1965), p. 497.
DORFLER 267

[44] Moore, G. A., Photo. Sci. and Eng. 8, 152-161 (1964). [45] Moore, G. A., NBS Report 9428 (Proc. 3rd Int. Materials Sym.) (1966). [46] Moore, G. A., NBS Report 8073 (1963). [47] Moore, G. A.,and Wyman, L. L.,Journ. Res. NBS67A, 127-147(1963).

[48] Ramsey, J., and Weinstein, P., The Electron Microprobe, McKinley et a!., (1966)pp. 715.

[49] Dorfler, G., Report at the Congress "Metailkundliche Analyse", Vienna, 1966, Microchim. Acta, in print, (1966). [50] Dorfler, G., Berg-und Huttenmann, Mh. Ill, 438-443 (1966). [51] Dorfler, G., Z. Anal. Chem. 221, 357-366 (1966). [52] Dorfler, G., Monatsh. Chem. in print, (1967). [53] Philibert,J.,andBeaulieu,C.,Rev. Met. 56, 171-178(1959).

[54] Crussard, C, Kohn, A., Beaulieu, C, and Philibert, J., Rev. Met. 56 (4), 395- 406(1959).

[55] Yakowitz,H.,etal.,NBS Misc. Publ. 260-10,(1965).

[56] Yakowitz, H. , et al., N BS Misc. Publ. 260- 12,(1 966).

SOME ASPECTS OF THE MICROPROBE

ANALYSIS OF BIOLOGICAL SPECIMENS

T. HALL

Cavendish Laboratory, Cambridge, England

Abstract

A method suitable for the quantitative microprobe analysis of thin

inhomogeneous biological specimens is presented. The intensity of a

characteristic radiation is normalized against the intensity of the

continuum-radiation which is simultaneously generated in the

specimen. Because the method is based on ratios, it is not upset by

variations in specimen thickness or density and there is no need of

corrections for backscatter or "penetration". Thin standards are used, but there is no need for any standard of known thickness or mass per unit area or for any calibration mixture. Both weightfractions and changes in spatial concentrations (i.e., elemental mass

per unit volume) can be measured. The method is restricted to specimens in which, on the average, the incident electrons lose only a small fraction of their energy and x-ray self-absorption is small; for

30 kV electrons and K x-rays from elements of atomic number

Z^14, these conditions are satisfied in most soft tissues sectioned

freshly frozen at a thickness of 10 fjum or less and dried with no embeddmg material.

Other subjects which are discussed because of their special

importance in biological probe work include the preservation of

spatial resolution in specimens of low stopping power, the choice of

operating conditions (column kV, etc.), histological correlation, the

improvement of spatial resolution, and specimen-preparation and

the prevention of probe-damage. Calculations suggest that for thin

specimens, high column voltages should be used. For meaningful

quantitation, soft biological tissues should be prepared as simply as possible to avoid removal or displacement of elements prior to

analysis. In this respect unstained sections of unembedded fresh- frozen tissue seem best, but in such preparations histological

correlation is difficult. The best histological correlation in unstained

sections is provided perhaps by the transmission electron image

available in combination electron microscope-microanalyzers,

269
270 ELECTRON PROBE

although there is danger of elemental loss in the procedures needed

for the preparation of the very thin sections for transmission

electron microscopy.

Preface

Experience has shown that probe specialists pay no attention to biological papers at probe meetings. There is mild interest when a

biologist discusses technical problems common to most work, but

when he talks about less familiar problems which are especially

urgent for biological applications (as I shall), the audience auto- matically switches off. This is natural. I am bored stiff by most

refinements of the conventional theory of quantitation because they

are irrelevant to my problems; to follow these developments I have

had to overcome a barrier which naturally also blocks attention

from the other side. So I have to begin by persuading you to read

this paper.

I want the paper to be read because it is high time to have expert

outside consideration of the line of work which my laboratory has

pursued for several years. If we are on the wrong track we had

better be corrected. If we are on the right track we should be

moving faster, along with more people going in the same direction.

You should read the paper because:

1. You owe it to the biologists who come to you for help. The

techniques which have been developed for probe studies of minerals and metals will not take biologists very far on most of their

problems.

2. While I am concerned only with biological specimens, much

of the paper is applicable to the analysis of organic materials in general, and especially to the analysis of very thin specimens.

1. Introduction

The microprobe should be making a big contribution to biology.

When a biologist hears of an instrument capable of elemental assays

of amounts down to about lO"''^ gms and weight-fractions down to about lO""*, with a spatial resolution around 1 /xm, he may anticipate

exciting discoveries involving the naturally occurring elements Na,

Mg. P, S, CI, K, Ca, Fe, Cu, Zn and 1. In addition he can expect help

in the use and evaluation of standard histochemical stains containing

Cr, Co, Ga, In, Pb, Os, U and many other elements. So he is optimistic (even a bit gay) when he brings his specimen to a probe,
HALL 271

generally in a department of metallurgy, mineralogy, physics or

engineering, or at the applications-laboratory of a probemanufacturer.

I believe the experience is usually disappointing. In fact, with only

a few exceptions, successful biological probe studies have been

limited to observations of calcified tissues consisting mainly of

apatite or similar minerals, and the identification of elements in foreign bodies. The reason is that the techniques developed for minerals and metals are insufficient for most biological probe work

(and indeed are often inadequate for problems involving calcified

tissues and foreign bodies as well). The technical difficulties are outside of the biologist's field and outside the experience of the owner of the probe. The biologist may hang on long enough to get

something that he can put into a paper, but he usually decides that the promise of the probe was illusory and he had better keep to more

orthodox methods in the future.

I believe that the technical problems peculiar to biological probe

work are now well characterized; that solutions to most of the

problems can be formulated; and that the instrumentation needed to implement these solutions already exists or is in the works. Hence

the probe should be playing a much larger part in biology than is now

the case. In the following sections I want first merely to specify the

difficulties, then to discuss the solutions as they appear to me, and

finally to summarize with a personal view of the most promising line of development.

II. Discussion

A. A DESCRIPTION OF THE PROBLEMS

The major problems of biological probe work are quantitation and

interpretation of the x-ray data, the preservation of spatial

resolution, the correct choice of operating conditions (column kV,

probe current, etc.), histological correlation, the improvement of

spatial resolution, and specimen-preparation and the prevention of

probe-damage.

Quantitation and interpretation: the standard theory of static- probe analysis assumes that the specimen is thick (i.e., opaque to the

probe) and that the incident electrons and the emergent x-rays are confined to a homogeneous region. Furthermore, the theory deals

with the measurement of weight-fractions (mass of element/total mass of specimen, often called "mass concentration") but provides
272 ELECTRON PROBE

no way to measure spatial concentrations (mass of element/volume).

Hence the standard theory is not suitable for soft biological tissues

where one must usually be concerned with both weight-fractions

and spatial concentrations, and the specimens are inhomogeneous,

as well as thin in the most interesting cases.' With few exceptions,

the standard quantitative theory is applicable in biology only to calcified tissues consisting of apatite or similar minerals. Even here,

local variations in density produce deceptive effects precisely in the

transitional zones which are the most interesting to study. (See for example the discussion by Frazier [1] of misleading data obtained

at the enamel-dentine interface in teeth.)

There is one important mitigating feature about quantitative

assays of biological specimens. High accuracy is generally not wanted. Errors of 10 or even 20% are usually quite tolerable. The

problem is not to be accurate, but to avoid being badly misled.

The preservation of spatial resolution: the range of a 30 kV

electron in dried soft tissue is of the order of 50 (xm. For the

preservation of a spatial resolution of the order of 1 /u,m, two

approaches haye been successful. One can use low-energy, short- range electrons in the probe, or one can study thin specimens, for example ordinary histological tissue sections. These alternatives

will be compared later. Choice of operating conditions (column kV, etc.): for thick

specimens it is well known that the analytical sensitivity depends

strongly on the choice of operating conditions, and formulae

predicting optimum conditions have been worked out. For thin

specimens the optimum conditions are quite different, and some

rough formulations for this case will be given below.

Histological and cytological correlation:'^ this is one of the most

serious difficulties in biological probe work. The biologist wants to measure elemental concentrations within certain components of

' Tissues which are not calcified are called "soft", so the term encompasses the great majority of biological materials. In vivo, most soft tissues are 50-90% water by

weight. In the probe the water is gone (usually removed early in the preparative

procedure and otherwise lost to the vacuum). What remains is spongy with tremendous local variation in the density of packing. It follows that one can get a good picture of the structure of a tissue only if one keeps in mind the distinction between weight-fraction and spatial concentration, and learns about both. This

point will be made clear by an example later on.

2 Histology is the study of tissues and cytology is the study of cells.
HALL 273

tissues, such as different types of cells, intracellular organelles like nuclei and mitochondria, extracellular protein aggregates like collagen and elastin, and extracellular ground substance. But once

the specimen is inside the instrument, the interesting components

may not be identifiable in either the electron-scan image or the

optical microscope. Optical microscopy may be quite handicapped

by the presence of a heavy conducting coating.

The improvement of spatial resolution: there is no lack of

important biological work for probes at a spatial resolution of one or

a few ^tm. But biologists studying ultrastructure, especially electron

microscopists, rapidly lose interest in probes when they learn that the resolution is not better than 1 fxm. (And a conventional

instrument cannot offer them better than 1 ixm. Merely to reduce the

diameter of the probe, with their very thin EM sections, would result

in a hopelessly low counting rate.) They will grant that 0. 1 /xm might

be quite useful, although they need 100 ^ or less to be really happy.

These aristocrats are doing the most fundamental biological

research and a considerable effort would be worthwhile if it could

provide them with a resolution of 0. 1 /xm.

Specimen-preparation and the prevention of probe-damage: here I shall only remark that probe-damage is a serious danger with

I biological specimens but it can usually be mastered. The topic is

i considered in slightly more detail later.

I have separated the description of the difficulties from the

discussion of methods because I believe that the foregoing brief

description of the situation is not controversial, and therefore it

i deserves to be free from association with the methods and views

j which I shall now present.

B. METHODS FOR BIOLOGICAL WORK

Quantitation and interpretation: there seems to be no prospect of

a theory of quantitation suitable for inhomogeneous thick

specimens, but we have developed a theory which seems to be

useful for measuring weight-fractions in thin biological specimens.

The weight-fraction Ca of an element a can be expressed in the

form

^ mass of element elemental mass/area

Ca= ; -= : (1) total mass total mass/area

1

I

I
274 ELECTRON PROBE

Our approach stems from the fact that in thin specimens of soft tissue, the intensity of an element's characteristic X-radiation is approximately proportional to the local elemental mass per unit area, while the intensity of white X-radiation is approximately

proportional to the local total mass per unit area. When we observe

the intensity of a characteristic radiation, we simultaneously record

the intensity of white X-radiation, using a second counting system

which "looks" directly at the specimen (non-diffractively) and

accepts a suitable band of quantum energies. In first approximation

the ratio of the two counting rates is proportional to the elemental

weight-fraction.

Two versions of this scheme have been developed in my

laboratory. I shall refer to them (rather inappropriately) as the

"relative" method and the "absolute" method.

a. The relative method: this procedure, the more empirical of the

two, was described [2] at the Washington probe conference in 1964.

1 shall recapitulate it here. Given a thin specimen and a crystal spectrometer set for a

characteristic line, the spectrometer counting rate Y„ may be

expressed as a sum of linear contributions from the element of

interest (present in mass per unit area M,,) and from the remainder of

the tissue (present in mass/area M,„), plus a constant background B„

from the specimen-support and coating:''

Y„=K„„M„+Km„M,„+B„ (2)

(the quantities K being constants of proportionality determined

largely by the instrument). Similarly, the counting rate in the

"white" counter, ¥,„, is Ym = KamMa + KmmMm + Bm. (3)

The algebraic combination of equations (2) and (3) gives

Ma (Ye-- Ba) Kjji ni (Ym — Bm) Kma

it

' -Bm) Kaa (Ya — Bg) Kam

/Y.- f > .. ^ Km a \Y.- Bm/ K^^m Km m

"am

/Ya-Ba

\Ym - Bm

\ Kam

(4)

3 It is essential to use a very thin, uniform specimen-support.
HALL 275

I We now introduce the notations

I r = ; Te s ; = .

I Y^-Bn, Kan, K^^^,

j Then equation (4) can be written

M„ r,-r KaTM

Note that r is the ratio of the counts generated by the specimen in

i the two channels (spectrometer count/white count), re is the

' corresponding ratio for a thin film containing only the element of

I interest, and r,,, is the ratio for a thin specimen of organic material

containing none of the element of interest. (For pure organic

I material, the spectrometer count is due mainly to white radiation so

close to the characteristic line that it is not rejected by the

diffractor.) Thus, given thin films of the element of interest alone

! and of organic matrix alone, the ratios r can all be measured (with

due care to measure and subtract background from a supporting film

I when it is present and significant). These measurements and

j equation (5) then give a measure of MJMmThe following features of the relative method should be noted:

I 1 . The method measures MJMm with Ma the mass of the assayed

element and M„, the residual mass, i.e. the mass apart from Ma (so

that the total mass is Ma+Mm). The weight-fraction is Ma/(M,„+M«), which is nearly the same as M„/M,„ when Ma «M;„

2. In the form of equation (5) the method is relative. One may

compare MJMm in different spots in one or more specimens, but for an absolute measurement the instrumental factor Kmm/Kan, must be

determined. One can make the method absolute by calibrating with a

thin standard containing the element of interest in known weightfraction in an organic matrix. Then both MJMm and weight-fraction

C„ can be obtained absolutely. In practice the preparation of such a

, standard is difficult and we use the method predominantly for

relative measurements.

3. For relative measurements there is no need to prepare any

standard of known thickness or known mass per unit area. Furthermore, at low weight-fractions, r« it then follows from

equation (5) that for relative measurements one does not need r? or

the pure-element standard. Also the ratio rTM is essentially merely the

ratio of acceptance band-widths in the two channels, so that rTM can

1
276 ELECTRON PROBE

be measured on almost any thin material which does not introduce a

characteristic line into either channel. (We use a painted film of

Aquadag.) So standardization for relative measurements is quite

simple.

4. There is no restriction to small weight-fractions of the element

of interest. It does not matter if the efficiency of bremsstrahlung

production is different in the assayed element and in the remainder

of the tissue, since these efficiencies are given separate coefficients

in the formulation. However, the method does depend on a constant

efficiency of bremsstrahlung production and hence on a constant average atomic number in the remainder of the tissue. This

condition is quite well satisfied in most biological soft tissue (except

for fat, in which Z is approximately 15% less) but the method is upset if, besides the element of interest, another heavy element is

| present in high concentration.

5. As a consequence of the empirical nature of the procedure, it is not necessary to exclude the characteristic line of the element of

interest from the band of accepted white radiation. \ 6. Characteristic and white radiation are produced in parallel as \ the electrons dissipate their energy in the specimen. Because the

method is based on the ratio of characteristic and white counting '

rates, the method correctly measures local variations in weightfraction in spite of variations in thickness or density of the

specimens (and the results are also independent of fluctuations in intensity of the probe), and there is no need for corrections for

j backscatter or "penetration".

I think a description of a biological application will probably i provide a better grasp of the main features of the "relative" method

| and will help to clear up the fog induced by the preceding

paragraphs. Dr. R. T. Sims of the Department of Anatomy at i Cambridge and I have been collaborating [3] on a study of the j distribution of sulphur and of dry mass in layers of the skin. For

| present purposes the problem and the results can be represented

schematically as in Figure 1. There is a well defined boundary between the outermost part of

the skin, which is a dead layer named the "corneum", and the i/ directly underlying tissue, which is called the "viable epidermis". ; It was important to learn how the sulphur weight-fraction and the I density of the tissue varied on the viable side of the boundary, jl where there is intense metabolic activity. Line scans perpendicular ji:
HALL 277

ZERO LEVEL

Figure 1 . Schematics of sulphur distribution in skin.

to the boundary were performed on thin sections. The graph of the

characteristic count rate shows the variation in amount of sulphur

per unit area (solid curve in Fig. 1). The graph of the white count

along the line of scan, not shown because it is quite similar to the

solid curve (though not identical), depicts total mass per unit area.

I The dashed line is the graph of the ratio, depicting the sulphur

I weight-fraction.

I When the section is uniform in thickness, as is normal, the curve

of sulphur per unit area has the same shape as the curve of sulphur

per unit volume. Thus the solid curve directly depicts the variation

of spatial concentration. The normalization against the white count

enables us to depict the variation of weight-fraction. We need both

curves to see that at the boundary there is a steep accretion of

organic dry mass (synthesis and/or packing) and hence an increase

' in the spatial concentration of sulphur, but no increase in sulphur

' weight-fraction.

b. The absolute method: this system was developed by D. J. Marshall at the Cavendish Laboratory. It was described [4] at the

Paris meeting in 1965 and is discussed more fully in Marshall's

recent Ph.D. thesis [5]. I shall recapitulate it ^here with small

changes in form.

li
278 ELECTRON PROBE

We start from the usual expression^ for the number T/„,dV dE of

white photons generated with quantum energies between V and

(V+dV) as an electron is degraded from energy E to energy (E-dE)

in a pure specimen of atomic number Z:

dV

7?w dV dE = kZ dE . (6) V

We shall use the Bethe expression for electron energy-loss, in the

form

dE = ^'L^' (NZB) dS (7) E

(Here e is the electronic charge, 4.8xlO-io esu; N = atoms/cc;

B= In E/H; and H is a function of Z which need not be specified more fully at this point.) For a mixture we now assume that the

energy lost to atoms to type "r" is given by

dE, = (N,Z3r) dS ; B, s ~ . (8) E Hr

We also assume'^ that when an electron travels a distance dS in a

mixture, the production of white photons from collisions with atoms

of type r is still given by

7?wrdVdE. = kZ, -TT^dE,, = k^ 1^ (N,Z2B,)dS . (9)

V V E

While the form of equation (6) may be unfamiHar, the content is merely the usual simple approximation that the decelerating electron radiates bremsstrahlung with uniform intensity per unit frequency interval up to the cutoff frequency (cf. Compton

and Allison, pages 93 and 105), and the usual approximation that the efficiency of bremsstrahlung production is proportional to atomic number (Compton and Allison, page 106).

In equation (8) one naturally uses the value of Hr which is accepted for element

r in the pure state. Equations (8) and (9) are then tantamount to the assumptions that the energy of the probe-electrons is dissipated in successive independent collisions with individual independent atoms, and that the ratio of white radiation produced to energy dissipated to any one element remains the same as in the pure state. These

assumptions are certainly not perfect. Chemical binding changes the energy levels of outer electrons and therefore changes the values Hr in a mixture, and the collisions are not simply with individual atoms, as shown by the existence of plasmalosses. But the end result is not affected much by the values chosen for the quantities Hr.
HALL 279

Then the total production of white photons from collisions with all types of atoms is obtained by simple summation and is

' HwdVdS = ki^ (IN.Z^B,) dS , (10)

V E

I But the number of characteristic photons of a given line from atomic

species a, produced in path dS, is of the well known form

Ha dS = wb In Na dS (11)

where Ea is the ionization-energy, w is the fluorescence yield, and b

! is a constant.^ Hence the ratio of characteristic photons/ white

' photons in a mixture, obtained by dividing (1 1) by (10), has the form

= c ^J:,^ (12) n^dV SN.Z^B,

r

(Here we have lumped into one constant c all the factors which are

irrelevant and destined to wash away later.) To use equation (12) in practice, measurements are made on the

specimen and on one standard. The standard does not have to be a

pure sample of the element of interest; it can be any thin material of

known composition containing the element of interest, and there is no need to know its thickness or mass per unit area. It follows from

equation (12) that

(characteristic count/ white count) gpg^^^^j^

(characteristic count/ white count) gj-^^^^j.^

_Na \

Vm 72 d ) r^^'^^f "/ specimen

(13)

iNrZ^Bj standard

''nads = t<jcrNads, where o- is the ionization cross section. For a 1 have used

o- = (27reVEE„ )b ln (E/E„

This form, arising from the wori< of Bethe, Mott. and Massey and Worthington

and Tomiin, is recommended by Green and Cosslett (Proc. Phys. Soc. 78 (1961), form (c) on page 1210).
280 ELECTRON PROBE

We should pause at this point to contemplate equation (13)

because it reveals the essential simplicity of the method at the

moment just before that simplicity is buried under a pile of notation

and superficial complexity.

We now make the definitions

(characteristic count/white counDspecimen

Q = - > (characteristic count/ white count) standard

and G - /

" V^N.Z.^B^ standard

Equation (13) may now be written

Na = QGSN.Z.'B, . (14)

r (Here and from this point on, all of the symbols with the exception

of Q and G refer to the specimen alone.) It is convenient to break

the sum S into two parts, the term involving element a plus the sum

over all the other elements, which we shall denote by the symbol 2'.

Thus IN,Z,'B, = N^Z^B^ + S'N,Z,^B, . (15)

r r By substituting (15) into (14) and solving for Na, we get

| QGS'(N,Z,'B,)

Na = • (161

1-QGZ2B3

In order to put the result in terms of weight-fractions C, onej

introduces the atomic weights A and the relation ! NaAa

Ca • (17!

Hence
HALL 281

The substitution of ( 1 6) into (18) gives

1 (l-QGZfBj2XA,

-r^= 1+ : (19)

A^QGS'N,Z,'B,

r

Equation (19) is convenient when the composition of the specimenmatrix is known directly in atom-fractions. However the

compositions of soft tissue, typical protein, etc., are usually quoted

in weight-fractions. To get a form which is more convenient for this case, we introduce the weight-fractions Cr of the various

constituents in the residual matrix (i.e., exclusive of the element of

interest, a):

i Hence

K =£l 1' NiAi . (21)

A, '

The substitution of (21) into the denominator of (19) leads to the

final form

1 , l-QGZ^B^

It should be noted that if the element of interest is not normally

present in the matrix, or is only a minor constituent, then the

quantities Cr may be read out directly from literature-tables of the

composition of the matrix. If the element of interest is a major

constituent assumed to be present with a given weight-fraction in the

tabulation, one can readily multiply the other tabulated weightfractions by a corresponding fixed factor to normalize them to the

residual rather than the total mass. Equation (22) is not nearly as inconvenient to use as it seems. Q is the only quanfity in it which has to be measured. For a given

element of interest, standard and probe-voltage, G may be

295-798 0-68— 19
282 ELECTRON PROBE

calculated once-and-for-all; and for a typical organic matrix and

probe-voltage, the sum S' may be calculated once-and-for-all.^ For

example, for the measurement of sulphur in organic matrices with 30

keV electrons, with a standard consisting of CaS04 (very finely

ground flakes), equation (22) reduces to

' <1-0.27.Q. . 03,

This is easy to use. The absolute method permits a refinement not available with the

"relative" scheme-ready extension to the case of two heavy

elements (or more, in principle) in the organic matrix. For example it

is important to follow the process of mineralization of tissues from

the very beginning (low concentrations of Ca and P) through

intermediate stages with substantial concentrations of Ca and P. As

a calibration standard we use apatite, sectioned at ^1,000 A. By

comparison with the Ca and P counting-rates in the standard, where

N/-/Nra is known to be 3/5, one can readily determine the value of

the ratio Q!=N/./Nr« in the spot which is to be analyzed in the

specimen. Equation ( 1 4) can be re-written in the form

= QGLNeaZLBca + NpZ^Bp +

(24) = QG[N,3(Ze'aBe3 + aZlBp) +

(where 1" denotes the sum over all elements except Ca and P)

and one then gets —1 Ap l-QG(ZLBea + aZ'iBp)

= 1 + a — + — ^ (25)

With an apatite standard and 30-keV electrons, equation (25)

reduces to

1 4.66

1 + 0.78 a + -r- [1-Q (0.54 + 0.32a)]. (26)

' One must choose one of the standard expressions for B,. The result is little affected by the choice. In the following equations I have used

Br= In (1.17 E/I \.5Zr) (with E in eV.)
HALL 283

This formula can be applied to measurements of Ca and P when

both are present in elevated concentrations in tissue which is otherwise essentially a simple organic matrix.

The following features of the absolute method should be noted:

1. It is essential to exclude the characteristic line of the element

of interest from the accepted band of white radiation.

2. As with the relative method, it is necessary to assume a certain

composition for the remainder of the specimen aside from the

element of interest, but again the method is not restricted to low

weight-fractions of the element of interest.

3. Again, the procedure is not spoiled by local variations in thickness or density of the specimen or by fluctuations in the

intensity of the probe, and there are no corrections to be made for backscatter or "penetration".

4. The strong point of the method, a really big advantage, is that it leads to absolute values of weight-fractions without the need to prepare calibration mixtures, or any standards of known thickness or mass per unit area at any time.

5. Uncertainties and errors: The assumptions in equations (8)

and (9) have already been discussed. But the chief error in the

scheme probably comes from the assumption that the

bremsstrahlung-production coefficient k in equation (6) is independent of atomic number. There is also uncertainty about the

dependence of H (equations 7 and 8) on atomic number, even in elements in the pure state. Marshall considers that these two factors

generally might lead to probable errors of the order of 20%; but in his experiments with binary mixtures, when he took k to be constant and used a conventional proportionality between H and atomic

number, his overall deviations from the results of chemical assay were usually in the range 5-10%. In fact it is known that k varies

with atomic number, and the errors would presumably be less if better values of k(Z) and H(Z) were established and used. It would

be easy to introduce these values into the formalism, and I believe

that good experimental determinations of k(Z) and H(Z) would be

valuable. In collaboration with Dr. H. J. Hohling of the University of

Miinster and others, I am now using the absolute method in studies

of Ca, P, and S at all stages of mineralization in thin sections of

arteries and embryonic bone. Our early results have been reported

[6] and the observations are being extended. I should not describe

the work in detail here, but it will be worthwhile to mention some of

the essentials.

i
284 ELECTRON PROBE

Among the experts there are contradictory views about the

process of biological mineralization. Some consider a buildup of

calcium to be the first stage while others believe that the initial step

is an orderly deposition of phosphate groups onto collagen. The

methods of study have been indirect and indeed most of the

controversy has been supported by experiments in vitro. We have

now shown by direct static-probe analyses that in arteries calcium

accumulates to high levels (to weight-fractions of 1% and more)

before there is a substantial accumulation of phosphorus, and we

have seen a similar pattern in embryonic chick bone. I shall confine

myself to a negative statement about our more recent results on

embryonic rat-tooth [7] because we have not yet reported them to

biologists. The pattern of mineralization in embryonic rat teeth is drastically different.

It is important to determine how the early calcium in arteries and

embryonic bone is chemically bound. A short time ago Dr. A. J. Hale and I tried [8] to confirm the hypothesis of a binding of

calcium to sulphated mucopolysaccharides. Mainly we studied x-ray scan images of calcium and sulphur, and the results were not very

convincing. At present Hohling et al. are trying quantitative static- probe analyses of Ca, P, and S and we may be able to reach a firmer

conclusion.

Equipped with methods which can measure locally not only the

ratios Ca:P:S but the weight-fractions and spatial concentrations of

these elements as well, and which are sensitive enough to work right

back to the really early stages (Ca weight-fractions of ~0.2%), I believe we are adding substantially to the understanding of the

mineralization of tissues. Marshall's thesis [5] leaves no doubt that the quantitative method

is essentially sound, and we are certainly getting reliable answers to the biological problems we are now attacking. However a huge

amount remains to be done to clean up the method, both with

respect to the underlying x-ray physical data and with respect to technique (assessment of various extraneous background effects,

etc.) and it would help if other people were working along the same

lines. I We have to consider how thin a specimen must be for the method

to be valid. Ideally a specimen should be thin enough for the average , energy-loss of the incident electrons to be very small and for x-ray I absorption to be negligible. Let us note first that so far as the I measurement of weight-fractions is concerned, a large decrement in
HALL 285

electron energy can actually be tolerated, because the ratio of

I characteristic production to white production does not change much

until the ionization cross section begins to decrease (i.e., when E

drops below cEa). On the other hand, for a good proportionality

i between the generated characteristic intensity and elemental mass

per unit area, electron degradation must be more closely controlled.

However even in this respect one may readily estimate that for a 30

kV probe, 5-/>tm of dried soft tissue is comfortably thin and 10 /xm is generally acceptable.

X-ray absorption depends on takeoff angle and above all on the

penetrating power of the radiation of interest. But for example, with

a takeoff angle of 20° one generally does not need a correction for

I phosphorus-K or harder radiations in S-fim sections of soft tissue,

j For somewhat thicker sections, softer radiations or higher accuracy,

I a simple correction suffices: since the electron flux and x-ray

generation are uniform from top to bottom of a thin specimen, one may well approximate the average x-ray transmission by the

expression

ij f = e-^/^/p) csc^ (pt/2) (27)

' The correction for weight-fractions may be considerably less than

suggested by (27) since the white radiation may be similarly

attenuated.

Since the biologist likes to work with tissue sections 5-/Am or less

in thickness, our analytical method does not impose an onerous limit on thickness, at least for soft tissues. Calcified tissues must be

studied in thinner form but quantitation according to our methods is

still feasible, with some care, even for phosphorus-K radiation in apatitic specimens l/2-/xm thick, and there is no problem at 0. 1 /xm.

We should consider a completely different means of quantitationnormalization not against white radiation but against the

concentration of C, N, or O through the measurement of their

respective K radiations. This method is theoretically simpler than

those above and makes sense biologically, since the concentrations

of C and O are fairly good indices of the concentration of organic

matrix and the concentration of N is a good index of the

concentration of protein. (The carbon background from

contamination obviously raises a technical problem.) In practice I believe the high absorption of the soft C, N, and O radiations in specimen and conducting coating puts this method at a disadvantage.
286 ELECTRON PROBE

The preservation of spatial resolution: we have already noted that

in biological tissues, to preserve spatial resolution, one must either use a short-range, low-voltage probe, or study thin specimens. If one

observes only quite soft radiation (L-lines for elements like Fe and

Zn), one can use over-voltages of 3-4 and get good excitation

without excessive range. This has been proved in practice by

Andersen and Hasler [9]. As to the use of thin specimens, while I have not studied the matter as closely as I should, 1 considered it at one time with Hugh Bishop and we estimated that beam-spread is not bad for 30 kV electrons incident on S-fim sections of soft tissue.

I have not worked at all with low probe-voltages and soft radiations and I may be prejudiced against this approach as I do not even have suitable apparatus for it. Anderson and Hasler [9] have

demonstrated its high sensitiyity. But I believe that in comparison

with the alternative, the study of thin specimens at high voltage, the

low-voltage method is disadvantageous in several respects. I shall

list my doubts, perhaps unwisely as I am speaking now on the basis

of no experience.

a. Reliable quantitation seems impossible.

b. To study elements in low concentrations, high probe currents

are necessary with heavy conducting coatings to take away the heat. The soft radiations may be absorbed not only in the specimen but in the contamination layer and especially in the conducting coating.

c. There may be serious electron degradation and dispersion in the conducting coating.

d. If a thick specimen is used, heat-conduction is less effective

than for a thin specimen coated on both sides, so that less probepower can be applied. Also, histological correlation is more difficult

in thick specimens. If a thin specimen is used, low probe-voltage is no longer necessary for the preservation of resolution.

e. Elemental analysis with the soft radiations is complicated by

the chemical shift of x-ray lines. (Granted, the study of chemical

shifts may yield very important information about chemical states.) i Aside from these considerations, which seem generally to favor

| the study of thin specimens with high probe-voltages, there remains | the important question of the relative sensitivity of the two I approaches. This question is considered in the next section. i Choice of operating conditions (column kV, etc.) : in this section I have only estimations to offer. The calculations are tedious but the 1 conclusions seem interesting. Therefore I shall list the conclusions !
HALL 287

first, before the reader is put off by the calculations. Conclusions, all relating to thin specimens:^

a. Operation at low kV with the detection of L lines should give

better counting rates than operation at high kV with the detection of

i Klines, for the same probe current.

I b. If one insists on the same resolution (same spot-size) in both

I cases and always puts the maximum available current into the spot,

low kV operation should not give better counting rates.

c. If one puts maximum available current into the same spot in both cases, specimen-heating (which may well be the limiting factor)

should be approximately the same for the two modes of operation.

d. A third mode of operation is to run at the higher kV with

I detection of the L lines. The counting rate at maximum current

I should be slightly greater than at low kV, but not greater or only

I slightly greater than the rate for K-line detection, and the original

motivation for L-line operation, the applicability of short range

j electrons, would of course be abandoned.

e. Background should be similar for low-voltage L-line operation

and high-voltage K-line operation, or else worse at the low voltages.

I I shall not speculate further about low-voltage operation but will give some additional estimates for high-voltage work, indicating

that:

f. For fixed current, maximum counting rates should occur near a column voltage Eo = eEA (K-line detection, ionization energy Ea,

e^2.71828...).

g. For fixed current, optimum signal/background should occur

near Eo=e^EA.

I h. It is unrealistic to deduce optima in terms of operation at a

I fixed current. At higher kV one can put more current into a given

spot and specimen-heating will still not be greater than at lower kV.

If one always puts maximurn available current into a spot of fixed

size, the counting rate should rise with increasing Eo with no maximum (increasing as In Eo/Ea). High Eo's are nominally even more favored if one seeks optimum signal/background. However the

estimation only takes account of background generated in the

specimen, and the increase of extraneous backgrounds at high Eo

probably limits the height of kV to which one should rise.

* More precisely, the specimens under consideration are "thin" for high-voltage

electrons. They may be opaque to low-voltage probes.
288 ELECTRON PROBE

The estimations:

a. Counting rate n can be expressed as n« i w) ( X ATB) (28)

where i is probe-current, (/> is a mean ionization cross section, w =

fluorescence yield, X = crystal efficiency, A is a correction for absorption in the specimen, T is a correction for absorption in windows and B is a correction for backscatter. 1 shall neglect A, T,

and B. (In fact, A and T favor the use of characteristic lines of high

quantum energy and B favors the use of high-energy probeelectrons.) Also I shall assume that the probe-electrons enter the

specimen with energy Eo=eEedge and remain at that energy, where

ionization is at its peak. This assumption also is generous to the lowvoltage method, since this ideal condition can actually be maintained

at high voltage but there is really substantial (total) energy loss at low voltage.

If we now assume the same current i and the same crystal

efficiency X in the two cases, (28) reduces to

oc . (29)

Tables indicate that W/7wa~ 1 /4, roughly, and Burhop [ 1 0] indicates

(c/)/7c/)a)~30 for the peak ionization cross sections, so we end up with

a crude estimate

n,.~8nA (30)

for equal-current operation. (This is probably generous again to the low-voltage method, as most often Xk >X|.)

b. We need an estimate of the current which can be put into a

given spot-size. The usual expression for spot-diameter d is

d^ = + + , (31)

where do is the diameter of the Gaussian image of the source, ds is

j the diameter of the disc of confusion due to spherical aberration, and | dd is the diameter corresponding to electron-diffusion. We shall \ neglect dd, since it should be negligible for high kV in a thin

^ specimen, and we will grant the low-voltage method complete t success in controlling electron-range. I
HALL 289

Then Duncumb's expression for spot-size [11] reduces to

d2 = + §1 , (32)

(with G a parameter of the column and gun, a the angular aperture

and S the coefficient of spherical aberration).

Hence

2 (d^--^a^). (33)

(c^w) (XATB) G

At this point, one can maximize the right-hand side of (33) and get an optimum value for the aperture for a given spot-size. In fact the

optimum is aopi=idlSyi^. However it does not matter for our

purposes whether one works with optimum a or with fixed a. In

either case, since the optimum a is independent of £« (as S is

presumably independent of £«), the expression |^d-— ^a*'^ will

be the same at high and low kilovoltages. The significant result is that the available current i is proportional to Eo. When we introduce

a factor EkIEl into (30) to convert from a fixed-current to a fixedspot comparison, we get

n,<nA (34)

(constant spot-size).

c. The Bethe expression (7) suggests that heat-transfer per

electron is proportional to 1/Eo. (This should be a good approximation at high kV and at least a useful first approximation at the low

kV.) Since the current i varies as Eo for constant spot-size, the

heating should be similar at low and high kV.

d. The ionization cross section is known to depend on E

according to the form

1 7 E

Therefore, if i varies as Eo for constant spot-size, as one raises the

voltage and continues to look at L radiation, the product (i<^) and the

signal should increase in proportion to {In Eo/E/J. But when we

compare K and L counting rates at the same high kV, the relevant

factor is ((/)aW/7(/)aWa). This factor was estimated to be ^8 when (/>/.
290 ELECTRON PROBE

and <^A were at their respective peaks, but is reduced by a similar

factor [{Ei,ighlEiow) (In E,oJE/,/ln E/„^h/E/,)] in going from its peak to the high kV. Hence at the fixed high kV, the L counting-rate should

be less or not much more than the K rate.

e. For the white-spectrum background we shall start again from

the expression (see equation 6)

r}jW,E) dVdE = kZ ~ dE . (36)

Equation (36) describes the white yield per probe electron. If the

size of the spot is kept constant the available current is proportional

to E„ and — dV

T]^ (V,E) dVdE oc kZ — E dE . (37)

V

°

But the energy loss dE is proportional to 1/Eo, so

r= dV dV

n' (V,E) dV« kZ — oc — . (38)

'•^ V V

Now

c he

A = 2d sin0 = —= — . or u V

he HV

2dcos0d0 = — dV, or —oc cot^dO. (39)

V

Then the ratio of white-background counting rates for L-line and Kline detection (again neglecting factors like absorption, as above)

should be — oc t i , (40)

cote de K K
HALL 291

where d0/, and d^A are the angular acceptance bands of the

diffractors. According to published data, cotdt d0i^ and cot^^c d^A

may be fairly similar (for example, for ADP and LiF), or they may

favor the K-line detection if a less acute diffractor is used for the L

radiation.

f. At high voltage, the K-line counting rate for a thin specimen, at constant current, will be closely proportional to 4>k, and (/)a varies as

(1/Eo) In (Eo/Ea). This function has a maximum at Eo=eEA.

g. The white background generated in the specimen, at constant

current, should be proportional to 1/Eo (equation 10). The time t required to determine a signal-rate S in the presence of a background-rate B, to any predetermined accuracy, is known to be

proportional to B/S^. In this case

This function has an extremum at Eo=e^EK.

h. If Eo is increased with constant spot-size and with current always maximized, i varies as Eo and dE varies as 1/Eo, so the

heating should remain constant. The signal should vary as

hence it should rise with E„ like {In Eo/Ea), with no maximum. The

dependence of specimen-generated background on Eo should be B

varies as Eo (1/Eo) ~ constant. Thus the figure of merit S^B should

have the dependence S^/B varies as (ZtiEo/Ea)^, suggesting ever- reduced requisite counting-times as Eo is increased. In sum, the estimations indicate that for thin specimens one

should usually detect the K radiations and should use high column

voltages (Eo > cEa).

I have not tested the speculations expounded above, and am not aware that they have been tested. Maybe they are all wrong. I think

that experimental tests would be well worthwhile [12].

Histological and cytological correlation: the microprobe is used

most naturally in biology for localization in terms of structures commensurate with the resolution of the instrument. Mammalian

cells (mean diameters usually in the range 5-20 /xm), cell nuclei

E„ {In EyE^)2 {In EjEj,)'

(41)
292 ELECTRON PROBE

(mean diameters of a few /xm), and many other tissue-components of

similar size are prime objects of attention. One wants to see these

components in order to position the probe with respect to them.

The standard method for seeing these things is optical

microscopy, and the standard preparation is a specimen, most often a section, 1-5 /xm thick. Thicker sections are confusing because

layers of cells may be superposed and the thickness may exceed the

depth of focus of the microscope. In the microprobe, electron-scan

images also are available, but here again a thick specimen is unfavorable (unless the probe is run at very low voltage or the image

is based entirely on secondary electrons). So sections, a few /txm thick, are typical objects of study.

However, even in thin sections the interesting structures are often not identifiable in electron-scan images or in the optical microscope.

The optical-microscopical image of an unstained specimen is usually

inadequate,^ and the presence of a conducting coating may make it poorer still. Hence the problem of histological correlation is quite

serious. There are several ways to deal with it. First, there is the classical way of rendering the structures

visible — stains. Those which are conventional in optical microscopy

can be used in conventional probe work. In spite of the conducting

coating the stains will usually at least be visible. Also there are

stains containing heavy metals which will appear in the electron- scan image [13,14]. In instruments which combine probe facilities with transmission electron microscopy, the conventional EM stains

may be used. It is comforting to be able to fall back on the stains, but

I want to plead that they should be avoided if at all possible.

Conscientious histochemists know the doubt which clouds all observations when the specimens have previously been dragged

through a series of liquid baths. They resort to stains only because

they do not know how to get along without them, and they welcome

a method which can work on virtually unprocessed specimens. In

this respect the probe-technique has a great promise which should

not be abandoned lightly.'"

» Special techniques lii<e phase and interference microscopy may provide excellent images of unstained specimens. But these two methods work best on wet material, and they are generally not available within the instrument. '

I am arguing only for restraint in ordinary staining merely for morphology. Heavy- i metal stains with specific stoichiometric reactions may become valuable tools for

j quantitation [14]. And of course there is no argument against probe investigations !

in which the action of the stain is itself the object of the study [13].
HALL 293

r 1 have not had the opportunity to work with specimen-current

images, or to work much with instruments which incorporate good

optical microscopes. I can offer no suggestions for improving the

I performance of these facilities, but it is clear that such

i improvements would be important.

One possibility may be worth considering— bringing the quality of

the backscattered-electron image closer to that achieved in good

commercial scanning electron microscopes. While biologists are dismayed by the images which appear on the display-tubes of

microanalyzers, they are delighted by the images produced by

scanning EM's. In order to bridge the gap, I believe that the

j microanalyzer would not need three lenses, since spatial resolution

j is not at issue; perhaps the versatility of the electron-detector is the

important factor. Finally, histological correlation may be achieved by means of the

transmission-EM image in the EM-MA instruments. The

transmission EM-images of unstained specimens are appalling to electron-microscopists, but still they may show structure enough for one to place the probe successfully. We (Duncumb, Cooke, Hohling

and myself) have had some happy experiences of this kind with

I embryonic (wnmineralized) bone.

j The transmission image in EM-MA instruments can help in two

; ways: By virtue of higher contrast, it may reveal gross structures which are not seen in the optical microscope even though they are

quite large; and by virtue of good resolution, it may show structures important for the positioning of the probe, even though the probe

may have to be much larger than the structures themselves (and it may be desired to avoid them). The latter point should make it clear

that we need good resolution in EM-MA instruments intended for

biological microanalysis.

The improvement of spatial resolution: resolution is limited by the

decrease in available probe-current and the proportional loss of xray signal which must occur as the probe-diameter is reduced. To

see how this effect may behave in practice, I have set up a simple

formula and made a few estimations.

[ ' Suppose that the probe can produce S counts/ sec/ /xg/cm^ on a thin

'

' film of an element of interest, and that the background recorded on

an organic thin film is B counts/sec//Ag/cm2. Suppose that in a

• specimen with organic mass M /ag/cm^, the element to be assayed is

' present only in a "hot spot", with elemental mass fM ^g/cm^. (Then
294 ELECTRON PROBE

the local weight-fraction C is

fM f M + f M 1 + f

The hot spot may be smaller than the probe; we define

hot-spot area

(42)

g

probe area

Then the following formula" enables one to estimate the weightfraction which can be assayed in running-time t with probable

statistical error E:

f 1 1 +(l+8tE^MB)'/2

C = and f = . (43)

1 + f tE^MSg 2

The quantities inserted into the table below have been chosen as

follows: M = 3 /Mglcm'^: a reasonable guess for an organic section

between 300 and 1,000 K thick. S: For diffracting systems, the

sensitivity of a commercial instrument for some thin films was

measured and found to be in the neighborhood of 200 cpsZ/xg/cm^/jita

of probe-current. 1 have assumed that 1 ^la of probe can be fed into a

spot of diameter d = l /xm, so S is 200 cpsZ/xg/cm^ for a probe

diameter of 1 /xm. I have assumed that the available current for other diameters is (dj^^/'V^- so S for other probe-diameters is taken

to be S = 200 d'^i^.i^ b is deduced from the ratio S/B measured

concurrently on the same thin film in the commercial instrument. I have taken into account the fact that the background of white

radiation generated per unit mass is less in an organic matrix than in the metal films. S and B for the non-diffractive detectors: Not

enough work has been done to know what can really be expected (to

know, in particular, how close to the specimen the etector can

successfully be brought). The values of S in entries 7, 8, and 1 1 in the table may be optimistic, while entries 9, 10, and 12 are more

conservative. My S/B of 50/1 may seem optimistic at first glance,

but again one is aided by the low efficiency of production of white

background in an organic matrix.

" Derived in the appendix at the end of this section.

'2 Of course S varies a great deal depending on the element and the instrument. However, in first approximation, improving S by a factor m will improve d only

by a factor m^'*.
HALL 295

Table 1 . Estimates of Sensitivity

The table gives estimates of the weight-fractions which can be

measured in 20-second runs, with a probable statistical error of

20%, in specimens containing a heavy element in 3 (xglcm^ of

organic matrix.

Probe S B C

jj. m fi m

1. 1 1 200 0.2 0.003

2. 1 0.32 200 0.2 0.03

3. 0.32 0.32 10 0.01 0.04

4. 1 0.1 200 0.2 0.25

5. 0.32 0.1 10. 0.01 0.32

6. 0.1 0.1 0.5 0.0005 0.45

7. 0.32 0.1 5,000 100. 0.02 (optimistic?)

8. 0.1 0.1 250 5. 0.01 ( " )

9. 0.32 0.1 1,000 20 0.04 (conservative?)

10. 0.1 0.1 50 1 0.02 ( " )

11. 0.032 0.032 12.5 0.25 0.06 (optimistic?)

12. 0.032 0.032 2.5 0.05 0.20 (conservative?)

nondiffractive

(There is a slight inaccuracy for the high weight-fractions, entries 4,

5, and 6, where the background would come largely from the

element of interest and would be higher than tabulated, as the

tabulation is based on organic matrix.)

With small hot-spots one may either reduce the probe to the size

of the spot or let it remain larger, and it is interesting to compare the

anticipated results. The larger probe will not only give a larger total current; it will put more current onto the hot spot. On the other

hand, it can only generate pure background in the surrounding

tissue. When one uses a diffractor, which rejects background

relatively well, the net result seems to favor the larger probe

somewhat (for example, compare entries 2 and 3, or 4, 5 and 6). But

with non-diffractive detection, it should pay to bring the probe right

down to the size of the hot spot, in spite of the severe loss in probe

current (compare 7 vs. 8, and 9 vs. 10). The estimates suggest that for biological specimens, diffractive

systems will probably not be widely useful for hot spots with

diameters of 0. 1 /xm. Weight-fractions of 20% or more (entries 4-6)

are too rare. But I was happily surprised by the estimates for non-
296 ELECTRON PROBE

diffractive systems. Here there seems to be a real possibility of wide

application to 0.1 -/Am spots. There is even a suggestion of possible

non-diffractive analysis of spots down to 0.03 //.m (entries 1 1 and

Under the assumed conditions, 0.01-/u,m hot spots would be

beyond analysis. Even the non-diffractive detectors would run out

of counts. Having exhausted the hypothetical possibilities of the

detecting system one turns to the source, to query if more current can be put into the small spots. While "point" filaments (fieldemission or T-F) can put much more current than the older types

into very small spots (less than 0.01 fxin), my impression is that the

point-filament sources are not radically better for spots larger than i 0.01 /u.m. If so, the prospects seem poor for the probe microanalysis , of tissues in spots less than 0.03 fxm in diameter. This is not too grievous— 0.03 fim or even 0.1 fxm would be a splendid advance.

The development seems to hinge on non-diffractive detection, and I the various tactics familiar to the non-diffractive trade would have to j be brought into play to take care of the well known problems of

j element-interferences.

j In the discussion above I have failed to note that larger currents ' can be put into small spots by probe-forming lenses of low spherical

aberration. Such lenses must have short working distances, but this ' might be compatible with thin specimens studied in combination

electron microscope-microanalyzers. Castaing [20] pointed out in 1960 that an "ideal" lens might provide a current density | approximately thirty times higher than the value I have assumed. | This would make the prospects better than painted above. I am in no j position to judge how much of this factor can be realized in practical i designs. [ Note: Derivation of equation (43).

{ The hot spot contains (fM) /Ag/cm^ of the element of interest. If ' the probe is larger than the hot spot, the signal will be the same as if

\ there were (gfM) jxglcm^ of the element of interest throughout the ! area of the probe. (Here 1 am assuming, crudely and inaccurately, ! that the current is uniform over the probe-spot.) Hence in time t

j there will be (gfMSt) signal-counts and (BMt) background-counts.

12).

Total count = gfMSt+BMt. (44)

Calculated signal = (gfMSt+BMt) -BMt =gfMSt. (45) '
HALL 297

Probable error in calculated signal = [ ( gfMSt + B Mt) + B Mt] ^ / ^

= [Mt(gfS + 2B)]^/2 (46)

Fractional probable error E =

[Mt(gfS + 2B)]'/^ (gfS + 2B)^/2 =

(47)

gfMSt (Mt)^/2gfS

When this equation is solved for f, one gets equation (43),

1 1 + (1 +8tE2MB)V2

f = tE^MSg 2

Specimen-preparation and the prevention of probe-damage: I shall not discuss the techniques of polishing, etching, etc. because I know

very little about them and could only echo the literature. The

preparation of the surface of hard specimens is discussed in several

papers dealing with probe studies of bone and teeth [15-19,1]. A

technique for the infiltration of hard tissues to produce uniform

density has also been described [19].

My own laboratory is mostly concerned with the measurement of

low elemental concentrations in thin sections. I shall review the

preparative procedures suitable for such work.

To measure low concentrations, intense probes are needed. We

use 0. 1 -2 /xa. A heavy conducting coating must be applied to remove

heat — we apply 200-500 K of Al to each surface of the thin

preparation (a total of 400-1,000 K). Background must be

minimized, so we mount the sections on thin supports. Nylon film,

produced in the laboratory by casting on water, has been

satisfactory. At one time we used underlying EM-type grids, but we

are better off without the grids, presumably because thermal

gradients are less severe. The nylon is simply stretched over the

open ends of 3/8-inch diameter tubes. In such preparations probe-damage is not too frequent but it sometimes occurs. If the specimen disintegrates or curls up, one may try again. A much more insidious effect is the removal of the

element of interest from an apparently intact specimen. We have

encountered this only rarely, but one should watch closely as the

probe impinges on a field or a spot for the first time, to see if the x- ray count falls off from its initial value.

295-79 8 0-68—20
298 ELECTRON PROBE

As indicated earlier, the histologist must always worry about i artefacts. If histologists prepared their specimens themselves, or i even watched as their technicians did the job, they would not dare to believe that the final product is really like the original tissue. The ! sections are usually mangled, swished, stabbed, and shaken through ' a dozen or so baths of reagents and water. There is obviously a great

danger of displacement or loss of the interesting components. If it can be managed, probe-specimens of soft tissue should be prepared ' simply by quick-freezing the tissue, sectioning while frozen, and \ drying by sublimation with no thawing. The ability to analyze such i uncompromised material is one of the most important assets of the I microprobe method.

III. Summary

! Perhaps I should first summarize what I have not discussed,

j straightforward probe studies using only well known techniques.

There is a substantial literature about the foreign stuff which gets

j into bodies (mostly in the lung), about accretions in various organs '

(in the kidney, prominently), and about the distribution of minor

elements as well as Ca and P in teeth and bone. Such work is certainly useful, interesting and successful. 1 My own bias is towards a wider field of biological processes, both

healthy and pathological. There is a good future for microprobe

analysis in this wider field, but only with the help of appropriate i techniques. In my opinion one must concentrate on thin specimens,

put them on very thin supports, and develop a special quantitative ' theory for them. My guess is that the most important biological < probe work will be done on thin specimens in combination EM-MA | instruments, perhaps with very small spot-sizes and non-diffractive

j x-ray analysis.

j

IV. References '

[1] Frazier, Norelco Reporter 13, 25 (Jan. -March 1966).

[2] Hall, Hale, and Switsur in The Electron Microprobe (Eds. McKinley, Heinrich, and Wittry), John Wiley and Sons, New York 1966, p. 805. | [3] Sims and Hall, J. Cell Sci., in press. j [4] Marshall and Hall in X-Ray Optics and Microanalysis (Eds. Castaing, Des-

^ camps, and Philibert), Hermann, Paris 1966, p. 374.

[5] Marshall, D. J., Ph.D. Thesis, Cavendish Laboratory, Cambridge University, 1967. Also Brit. J. Appl. Physics, in press.

|
HALL 299

[6J Hohling, Hall, and Fearnhead, Die Naturwissenschaften 54, No. 4, 93 (1967). Hohling, Hall. Boothroyd, Cooke, Duncumb, and Fitton-Jackson, Die

Naturwissenschaften 54, No. 6, 142 (1967). Hohling, Hall, Boothroyd,

Cooke, Duncumb, Fearnhead, and Fitton-Jackson, Proceedings of the Conference on Calcified Tissues (meeting in Bordeaux, 1967), to be published by Springer.

[71 Hohling, Hall, and Boyde, Die Naturwissenshaften 54, No. 23, 617 (1967).

[8] Hale, Hail, and Curran in X-Ray Optics and Microanalysis (Eds. Castaing,

Descamps, and Philibert), Hermann, Paris 1966, p. 686. Hale, Hall, and

Curran, J. Path, and Bact., 93, No. 1, 1 (1967).

[9] Andersen and Hasler in X-Ray Optics and Microanalysis (Eds. Castaing,

Descamps, and Philibert), Hermann, Paris 1966, p. 310.

[10] Burhop, Proc. Camb. Phil. Soc. 36, 43 (1940).

[11] Duncumb, Brit. J. Appl. Physics 10, 420 ( 1 959).

12] Buchanan, R., has circulated an analysis somewhat similar to parts of this section in intent and contents. I do not know if his analysis has been published. 13] Hale, J. Cell Biol. 15, 427 (1962).

14] Sims and Marshall, Nature 212, 1359 (1966).

15] Boyde, Switsur, and Fearnhead, J. Ultrastruc. Res. 5, 201 (1961).

16] Boyde, Switsur, and Stewart, Proc. of the 9th ORCA Congress, Pergamon

Press, Oxford 1963, p. 185.

17) Mellors, Lab. Investigation 13, 183 (1964).

18] Soremark and Gr(6n, Arch. Oral Biol. 11, 861 (1966).

:i9] Frank, Capitant, and Goni, J. Dental Research 45, 672 (1966).

20] Castaing, Adv. Electronics and Electron Physics 13, Academic Press 1960.

; (See pages 329, 333, and especially 335.)

I

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