ide to NIST

U.S. DEPARTMENT OF COMMERCE

Technology Administration

www.nist.gov
On the cover:

Graphics of scientific and engineering

data or calculations often are used by NIST researchers to improve understanding of production processes, measurement methods, or scientific experiments. Shown on the cover from

right to left are computer-generated

graphics of:

• a scanning electron micrograph of a

negatively charged diamond tip used

in measuring surface roughness;

• an atomic-level image of chromium

atoms (bumps) alloyed in iron (flat areas ) made as part of a study of new

magnetic recording and storage

materials;

• a cubane molecule superimposed on a plot used to describe how these unusual cube-shaped molecules stack together in a solid;

• magnetic data "tracks" encoded on

a prototype reference sample that can be used to help improve the quality of computer disks;

• tree-like crystals growing as a pure

metal solidifies;

• the microstructure of a tin-oxide

film used in arrays of tiny sensors for detecting gases;

• the extent of chemical degradation on a biosensor film exposed to an elec- tron beam—heights of raised areas correspond to the degree of damage

in those areas; and

• the movement of smoke particulates

and combustion products from burning of a crude oil spill as predicted by

the NIST software program, ALOFT.
FOREWORD

Success in business these days is about specialties and partnerships—knowing what

you're good at and teaming with others to do everything else. At the National Institute

of Standards and Technology, our specialty

is technology and business infrastructure

putting in place key ingredients that industry

7 needs to thrive and help the economy

grow. Partnerships are central to everything we do. Infrastructure has no value if it is not

used.

This Guide to NIST is designed to help make

forming partnerships with NIST a little easier. Here you will find descriptions for more

than 300 different programs and projects

along with contact names, phone numbers,

addresses, and World Wide Web sites.

An agency of the U.S. Department of Commerce's Technology Administration, NIST's mission is to promote U.S. economic growth

by working with industry to develop and

apply technology, measurements, and standards. It carries out this mission through four major programs, each one addressing different components of the technology pipeline.

NIST's seven disciplinary Measurement and

Standards Laboratories work at all stages of

the pipeline from advancing basic science and pioneering new measurement methods

to the development of standard test methods,

materials, and data to ensure the quality of commercial products.

The Advanced Technology Program helps

fill the gaps that often exist between basic research advances and commercialization by providing cost-shared funding to industry

for development of high-risk, "enabling"

technologies with broad commercial

potential.

The Manufacturing Extension Partnership

uses a nationwide network of centers to help smaller manufacturers adopt technologies and business practices that can

improve their competitiveness in the global

marketplace.

Finally, the Baldrige National Quality Pro- gram provides information to companies of

all sizes on how to continuously improve

their products, services, and processes through effective business and quality

management.

I see several challenges ahead for NIST's

future. Shortening of product cycles, globalization of standards, the next generation Internet, continuous education and

training—these are trends that will pro- foundly affect the business of U.S. industry. NIST is responding with a number of new

initiatives including the construction of new

world-class research facilities, support for a comprehensive national standards strategy, increased emphasis by the ATP on joint ventures and participation by small to midsized firms, improved access for smaller manufacturers to MEP centers, and promotion of quality management concepts for the healthcare and education sectors.

And as we anticipate both the new millen- nium and NIST's 100th anniversary in 2001,

we're confident that some things will stay

the same—namely our commitment to accuracy, fairness, and scientific excellence. NIST's vision is to be the best in the world at what we do. We hope you'll take a moment

now to stroll through these pages and see how your organization might benefit by

joining us in that quest.

Raymond Kammer, Director

email: director@nist.gov

I
HOW TO USE THIS GUIDE

This guide is designed to make finding out about programs and contacts at the National Institute of Standards and Technology a little easier.

The pages that follow describe hundreds of NIST projects, grants, industry outreach pro- grams, services, and facilities, followed by

contact names; phone numbers; and mail,

electronic mail, and, in some cases, World Wide Web addresses for further information.

Unless otherwise noted, all addresses listed

are at MST, Gaithersburg, Md. 20899-

0001.

This guide is divided into chapters covering each of NIST's major operating units. In

addition, each chapter on the Measurement

and Standards Laboratories' programs

includes subheadings for NIST organizational divisions or subject areas.

NIST's Measurement and Standards Laboratories deliver essential public goods to companies, universities, and government

agencies. The reach of NIST's high-quality measurement tools, data, and services extends from science and medicine to industry and commerce and from health and the environment to law enforcement and

national defense.

Researchers in the NIST Measurement and

Standards Laboratories actively seek out

industrial and other collaborators to work

on well-defined, cooperative research projects of mutual interest. In addition, NIST

researchers collaborate informally with

industrial and academic researchers to solve shorter-term technical problems. For an

overview of the many different ways NIST may be able to work with your organization,

see a description of the NIST Measurement

and Standards Laboratories beginning on

page 35.

The Advanced Technology Program provides

multiyear, cost-shared funding for highrisk, high-payoff development of technologies by individual companies or industry-led

joint ventures. ATP accelerates development

of technologies that otherwise are unlikely

to be available in time to compete in rapidly

changing markets without such a partnership of industry and government. See

description on page 6.

The Manufacturing Extension Partnership

operates a nationwide network of regionally based extension centers that help smaller manufacturers adopt modern technologies and business practices. Through MEP even

the smallest firms have access to more than

2,000 knowledgeable manufacturing and

business specialists. See description on

page 25.

The Malcolm Baldrige National Quality

Award has become both the U.S. standard of performance excellence in business and a comprehensive guide to quality improve- ment. The Baldrige National Quality

Program, which manages the Baldrige

Award, develops and disseminates evaluation criteria and provides global leadership

in promoting quality awareness and in the sharing of successful quality practices, principles, and strategies. See description on

page 33-

A detailed subject index begins on page 170. Due to the interdisciplinary nature of NIST's work, many topic areas appear in more than one chapter. For example, research involv- ing polymers is described in different chapters: polymer processing and structure

investigations within the Materials Science and Engineering Laboratory and polymer

combustion studies within the Building and

Fire Research Laboratory.

This guide attempts to include all major NIST program areas. However, no single

report can be completely comprehensive.

Institute programs change constantly as new research results and technologies

become available. If you don't find a topic area that specifically matches your needs, contact the office for the research area closest to your field of interest.

If you review this guide and you're still not

sure which office to call, the NIST General

Inquiries unit probably can help you.

Contact: General Inquiries (301) 975-NIST

email: inquiries@nist.gov

fax: (301) 926-1630 A903 Administration Building NIST

Gaithersburg, Md. 20899-0001
CONTENTS

4 NIST at a Glance

6 Advanced Technology Program

25 Manufacturing Extension Partnership

33 Baldrige National Quality Program

35 Measurement and Standards Laboratories

40 Building and Fire Research Laboratory

51 Chemical Science and Technology Laboratory

76 Electronics and Electrical Engineering Laboratory

99 Information Technology Laboratory

109 Manufacturing Engineering Laboratory

126 Materials Science and Engineering Laboratory

144 Physics Laboratory

164 Technology Services

170 Facilities Index

170 Subject Index
NIST AT A GLANCE

The National Institute of Standards and

Technology was established by Congress "to

assist industry in the development of tech- nology ... needed to improve product quality, to modernize manufacturing processes,

to ensure product reliability ... and to facilitate rapid commercialization ... of products based on new scientific discoveries."

An agency of the U.S. Department of Commerce's Technology Administration, NIST's primary mission is to promote U.S. eco- nomic growth by working with industry to develop and apply technology, measurements, and standards. It carries out this mission through four interwoven programs:

• the Measurement and Standards Laboratories, providing vital components of the nation's technology infrastructure needed

by U.S. industry to continually improve products and services;

• the Advanced Technology Program,

providing cost-shared awards to industry for development of high risk, enabling tech- nologies with broad economic potential;

• a grassroots Manufacturing Extension

Partnership with a nationwide network of

local centers offering technical and business

assistance to smaller manufacturers; and

• a highly visible quality outreach program

associated with the Malcolm Baldrige National Quality Award that recognizes busi- ness performance excellence and quality achievement by U.S. manufacturers and

service companies.

BUDGET

$790 million (FY 1998 estimated operating resources from all sources)

STAFF

About 3,300 scientists, engineers, technicians, and support personnel, plus some

1,250 visiting researchers each year

SITES

Gaithersburg, Md. (headquarters

234-hectare campus) and

Boulder, Colo. (84-hectare campus)

MAIN RESEARCH AREAS IN NIST LABORATORIES

Building and fire research Chemical science and technology

Electronics and electrical engineering Information technology

Manufacturing engineering

Materials science and engineering

Physics

ADDITIONAL SOURCES OF INFORMATION

NIST issues more than 400 publications each year, such as reports on research

results and standards, catalogs of products and services, and technical handbooks. NIST staff also author about 1,650 technical journal papers. To locate current and past

Institute publications, call General Inquiries

at (301) 975-NIST (6478).

The Institute also publishes serial publications. The Journal ofResearch of the National Institute ofStandards and Tech- nology reports NIST research and develop- ment results in physics, chemistry,

engineering, mathematics, and information

technology, with major emphasis on meas- urement methodology and basic technology

underlying standardization. Issued bimonthly. Subscription price: domestic

$34 per year, foreign—$42.50 per year. Contact: (202) 512-1800.

Technology at a Glance is a four-page, lay language newsletter providing brief updates on NIST research, grants, and other pro- gram activities, with a contact name for each topic covered. Issued quarterly. Free subscription. Contact: Gail Porter, (301) 975-3392.

News and general information about NIST

programs and services are available on the World Wide Web at www.nist.gov. Links to homepages for NIST major programs

Laboratories, ATP, MEP, and Baldrige—are available through the NIST homepage. The

homepage also links to NIST Time, a staff

locator, and events calendar. The site has

information on Standard Reference Materials, Standard Reference Data, calibrations, standards services, and facilities. In addition, the site provides tour information;

press releases; budget updates; congressional

testimony; maps of NIST's Gaithersburg,

Md., and Boulder, Colo., facilities; and

answers to some frequently asked questions.
NISTATAGLANCE

Click on "NIST in Your House" and "NIST

and Your City" to find out where NIST

research has had an unseen role in your

everyday life. To find the NIST connection, you can click on items such as a smoke

detector, watt-hour meter, car, hospital, and

a factory.

FREQUENTLY REQUESTED NIST CONTACTS

General Inquiries

(301) 975-NIST (301-975-6478)

email: inquiries@nist.gov A903 Administration Building NIST

Gaithersburg, Md. 20899-0001

Advanced Technology Program

(800) ATP-FUND

(800-287-3863)

Manufacturing Extension Partnership

(301) 975-5020

(800) MEP-4MFG for center serving you

Baldrige National Quality Program

(Malcolm Baldrige National Quality Award)

(301) 975-2036

Measurement and Standards Laboratories

Building and Fire Research

(301) 975-5900

Chemical Science and Technology

(301) 975-3143

Electronics and Electric Engineering

(301) 975-2220

Information Technology

(301) 975-2900

Manufacturing Engineering

(301) 975-3407

Materials Science and Engineering

(301) 975-5658

Physics

(301) 975-4200

Technology Services

Calibrations

(301) 975-2002

Industrial Partnerships (301) 975-3084

Laboratory Accreditation (301) 975-4016

Metric Program

(301) 975-3690

Small Business Innovation Research Program

(301) 975-3085

Standard Reference Data

(301) 975-2208

Standard Reference Materials (301) 975-6776

Standards Information Center

(301) 975-4040

Weights and Measures

(301) 975-4004

NIST Organization

Boulder Laboratories

David Norcross

Administration

Jorge Urrutia

Director Raymond Kammer

Acting Deputy Director Robert Hebner

Technology

Services

Peter Heydemann

National Quality Program

Harry Hertz

Office of the Chief Financial

Officer

Robert Hebner (act)

I

Advanced

Technology Program

Lura Powell

Electronics and

Electrical Engineering

Laboratory

Judson French

Manufacturing

Engineering

Laboratory

Richard Jackson

Chemical Science and Technology

Laboratory

Hratch Semerjian

Physics

Laboratory

Katharine Gebbie

I

Materials Science and Engineering

Laboratory

Leslie Smith

Manufacturing

Extension

Partnership

Kevin Carr

Building and Fire Research

Laboratory

Richard Wright

Information Technology

Laboratory

Shukri Wakid
ADVANCED

TECHNOLOGY PROGRAM

Overview

Not-yet-possible technologies are the domain of the NIST Advanced Technology

Program (ATP). A new synthetic materials technology that might revolutionize the auto industry—if the process variables can

be identified and controlled. A new polymer

that can be used as a drug, ensnaring and

neutralizing dangerous pathogens—if the design and manufacturing issues can be overcome. A new concept in distributed infor- mation systems that could both cut costs and potentially save lives in the nation's

hospitals—if the proper software tools can

be developed to make it cost effective on a

large scale.

The ATP is a unique partnership between government and private industry to conduct

high-risk research to develop enabling tech- nologies that promise significant commercial payoffs and widespread benefits for the economy. The ATP provides a mechanism

for industry to extend its technological reach and push the envelope of what can be

attempted.

Lowering the Barriers to

High-Risk Research

Technology research in the private sector is driven by today's economic realities. Markets are global—your competitors can be anywhere in the world. The pace of technological change is faster than ever before, and victory goes to the swift. These realities

force companies to make narrower, shorter- term investments in R&D that maximize

returns to the company quickly. A project

may offer the possibility of important benefits to American industry or the public, but

in hard-nosed business calculations, those

benefits are worth only as much as the innovating company can recoup in profits.

The ATP views R&D projects from a broader

perspectiveits bottom line is how the project can benefit the nation. In sharing the

relatively high development risks of tech- nologies that potentially make feasible a broad range of new commercial opportunities, possibly across several industries, the ATP fosters projects with a high payoff for

the nation as a whole—in addition to a

direct return to an innovation. The goal of

the ATP is economic growth and the good

jobs and quality of life that come with eco- nomic growth—opening new opportunities

for U.S. business and industry in the world's markets by fostering enabling technologies

that will lead to new, innovative products,

services, and industrial processes.

The ATP has several critical features that

set it apart from other government R&D

programs:

• ATP projects focus on the technology

needs of U.S. industry, not those of govern- ment. The ATP is industry driven, which

keeps the program grounded in real-world

needs. Research priorities for the ATP are set by industry: for-profit companies conceive, propose, co-fund, and execute ATP projects

and programs based on their understanding

of the marketplace and research

opportunities.

• The ATP has strict cost-sharing rules.

Joint ventures (two or more companies working together) must pay at least half of the

project costs. Large, "Fortune-500" companies participating as a single firm must pay

at least 60 percent of total project costs.

Smaller companies working on single firm ATP projects must pay a minimum of all

indirect costs associated with the project. (This provision encourages small companies, particularly start-ups, that often have

limited R&D budgets and much lower over- head rates than large firms.)

• The ATP does not fund product develop- ment. It supports technologies that are

essential to the development of new products, processes, and services across diverse application areas. Private industry bears the

costs of product development, production,

marketing, sales, and distribution.

• ATP awards are made strictly on the basis

of rigorous competitions designed to select the proposals that are best in terms of innovation, technical risk, the potential eco- nomic benefits to the nation (not just the

applicant), and the strength of the plan for eventual commercialization of the results. Expert reviewers (without conflicts of interest) drawn from the economic community,

government, and academe carefully examine and rate each proposal according to published selection criteria that focus on both economic and technical potential. Proprietary information is protected carefully.

ATP support does not become a perpetual

subsidy or entitlement—each project has

goals, specific funding allocations, and completion dates established at the outset. Projects are monitored and can be terminated

for cause before completion.

The ATP partners with companies of all

sizes, encouraging them to take on greater technical challenges with potentially large

benefits that extend well beyond the innovators—challenges they could not or would

not do alone. For smaller, start-up firms, early support from the ATP can spell the

difference between success and failure. To

date, more than half of the ATP awards have gone to individual small businesses or to

joint ventures led by a small business. Large

firms can work with the ATP, especially in

joint ventures, to develop critical, high-risk

technologies that would be difficult for any

one company to justify because, for example, the benefits spread across the industry

as a whole.
ADVANCED TECHNOLOGY PROGRAM

An ATP Project Sampler

The ATP portfolio is highly diversified. The 352 projects selected in the first 30

competitions span a broad array of key

technologies, with particular concentrations in information technology, biotech- nology, electronics, advanced materials, and manufacturing. These awards represent an investment of S2.3 billion shared almost equally by industry and ATP. More

than 800 companies, universities, inde- pendent non-profit research organizations, and government laboratories have

participated in ATP projects. Several hundred additional organizations have partici- pated as subcontractors and strategic

partners. Over half of the awards were made to small businesses or to joint ventures led by a small business.

Representative projects include:

• A new DNA sequencing technologydeveloped by GeneTrace Systems, Inc. (Menlo Park, Calif.), under the ATP gets

results hundreds of times faster than current methods at a fraction of the cost. The

system identifies the sequence of base chemicals in a given DNA strand in as

little as five seconds rather than the three hours required for conventional DNA separation methods. This research is expected

to lead to inexpensive yet highly effective new drugs and widely available tests for

disease diagnosis and identification, such

as forensic and paternity testing. The company expects its technology to lead to genetic screening tests for as little as a few

dollars, compared with the $300 to $5,000

required today.

• A wide range of U.S. manufacturers

could save substantially if they adopt the new spindle designs developed in a joint venture co-funded by ATP. Spindles

(the rotating parb that hold cutting instruments in machine tools) are critical

in manufacturing because they strongly

influence production rates and parts quality. A team led by the National Center for Manufacturing Sciences (Ann Arbor, Mich.) designed and currently is testing three prototype spindles that are smaller,

faster, and more flexible that conventional designs and offer new capabilities

as well. For example, one design could

save the auto industry more than 100,000 hours in annual machining time for a

single part.

• Nanophase Technologies (Burr Ridge,

111.) used ATP co-funding to develop a

novel process for producing uniform, nanometer-scale ceramic powders.

The original target for such ultrafine powder was the manufacture of highperformance ceramic components for the automotive and aerospace industries, but along the way Nanophase discovered several other applications, including wafer

polishing agents for the semiconductor

industry and cosmetic and skin-care products (the tiny iron oxide particles have good sunscreen properties). The market

potential for the company's powder products could reach $80 million by the turn

of the century. Since the beginning of the company's participation in the ATP as a

tiny start-up, total employment has

increased from 5 to 68 people; annual

revenues have increased 10-fold.

• A new type of "molecular recognition"

technology developed by IBC Advanced

Technologies of American Fork, Utah,

may help crack one of the $1.2 trillion world chemical-processing industry's most intractable problems: how to selectively remove economically important or environmentally hazardous molecules from industrial fluids and waste. With ATP

co-funding, the company is combining

computer modeling expertise and some

Nobel Prize-winning research into a

highly efficient chemical separation tech- nology with broad applications, from

extracting and refining base and precious metals to creating ultrapure substances

for pharmaceuticals. Several major chemical processors have licensed the technology, and IBC has begun to market

separation systems to the metals industry.

• With assistance from the ATP, a small company called Aastrom Biosciences Inc. (Ann Arbor, Mich.) has developed the first device to successfully grow functional, therapeutic human cells outside the body.

The desktop bioreactor developed by Aastrom—now in clinical trials—successfully induces the growth and replication

of stem cells, precursor cells normally found in bone marrow that mature into blood and immune system cells. If approved (and initial results are promising), the Aastrom technology could mean

the end of a painful procedure of harvest- ing bone marrow for transplantation

(often part of cancer therapy). Some studies also indicate that the cultured cells may be safer—less likely to be contaminated with tumor cells.

• Vastly more powerful computers

and cellular telephones are among the products that could result from an ATP

project that developed new materials for integrated circuits (ICs). Texas Instru- ments (Dallas, Texas) incorporated xerogel, a near-perfect insulator consisting of

tiny glass bubbles, into ICs for the first

time. The material now is being commercialized by a major materials supplier for the electronics industry. Xerogel could

fuel at least 10-fold increases in the speed

of microprocessors and digital signal

processors.
ADVANCED TECHNOLOGY PROGRAM

Universities and non-profit independent

research organizations also play significant

roles as participants in ATP projects. Out of

the more than 350 projects selected by the ATP since its inception, well over half of the

projects included plans to involve one or more universities as either subcontractors or

joint-venture members. In many of these

cases, more than one academic institution was involved. There are more than 300 indi- vidual instances of university participation

in ATP projects all told.

Programs and Competitions

The ATP conducts two types of competitions

for new R&D projects, each with its own

advantages. General competitions, open to proposals from any field, ensure that all good ideas receive consideration, no matter what the technology area, and result in some of the ATP's most innovative projects.

At least one general competition is held

every year.

Focused program competitions were created

to provide a critical mass of support for

high-risk, enabling technologies in particular technology areas that have been identified by U.S. industry as offering especially

important opportunities for economic

growth. An ATP focused program identifies a

specific set of research and business goals

that require the parallel development of a

suite of synergistic R&D projects. By managing groups of projects that complement and

reinforce each other, the ATP reaps the benefits of synergy and, in the long run, can

have a stronger impact on U.S. technology and the economy.

Focused programs are developed in response

to specific suggestions received from industry and academia. The proposals outline a

specific technology area and describe the

potential for U.S. economic benefit, the tech- nical ideas available to be exploited, the strength of industry commitment to the work, and the reasons why ATP funding is necessary to achieve well-defined research and business goals. Areas that attract particularly strong interest then are developed

further through discussions with industry,

meetings, workshops, and other interactions.

Within a focused program, the ATP holds

special competitions open only to project

proposals that would advance the goals of the specific program. Individual projects are

selected through the normal ATP competitive review process. The ATP has established

17 focused programs to date.

Focused Program

Descriptions

Information Technology

and Electronics

Adaptive Learning Systems. To develop new enabling technologies for flexible, network-based (including web-based) learn- ing systems, including intelligent authoring

systems to reduce the cost and time to develop educational content; knowledge

management and interface technologies to improve the delivery of instructional content; and large-scale modular components,

instructional frameworks, and middleware

to support a highly usable, reliable net- worked learning environment that makes

training and education more accessible than ever before.

Contact: Richard Morris

(301) 975-4695

email: richard.morris@nist.gov A426 Administration Building

Component-Based Software. To

develop the technologies necessary to enable

systematically reusable software components—small, carefully engineered software elements suitable for automated assembly in a broad array of applications.

Contact: Barbara Cuthill

(301) 975-3273

email: barbara.cuthill@nist.gov A426 Administration Building

Digital Data Storage. To support U.S. companies in exploiting the revolution in

digital storage by producing dramatic improvements in data storage technology in

six key areas: tape and disk storage density, higher performance magnetic recording

heads, new lubricants and surface finishes, more reliable tracking devices, improved

signal-processing electronics, and data

storage and retrieval software.

Contact:

Philip Perconti (301) 975-4263

email: philip.perconti@nist.gov A426 Administration Building

Digital Video in Information Net- works. To develop interoperable digital video capabilities for emerging information networks through techniques for encoding,

converting, and transcribing video data into the various forms required by the network. The program will help U.S. firms to take commercial advantage of the information network to allow any video-based information product to travel via wire, optical fiber,

satellite, or broadcast seamlessly into regular televisions and other information

appliances.

Contact: David Hermreck

(301) 975-4328

email: david.hermreck@nist.gov A426 Administration Building
ADVANCED TECHNOLOGY PROGRAM

Information Infrastructure for

Healthcare. To develop critical information infrastructure technologies to enable enhanced, more fully integrated medical

information systems across the healthcare

industry, increasing accessibility and uniformity while greatly reducing costs and

errors in handling medical information.

Contact:

Bettijoyce Lide

(301) 975-2218

email: bettijoyce.lide@nist.gov A426 Administration Building

Photonics Manufacturing. To develop

critical tools—packaging technologies, simulation and modeling tools, processing

methods, equipment, and instrumentation—needed by U.S. manufacturers to develop innovative photonics-based products

quickly and manufacture them efficiently in

large volume at low cost, improving their competitiveness in global markets.

Contact:

Philip Perconti

(301) 975-4263

email: philip.perconti@nist.gov A426 Administration Building

Technologies for the Integration of

Manufacturing Applications. To

develop and demonstrate the technologies needed to create affordable manufacturing

software applications that can be integrated

rapidly, reconfigured, and, in the long run,

- automatically adjust their performance in response to changing conditions and

requirements.

Contact: Selden Stewart

(301) 975-3833

email: selden.stewart@nist.gov A426 Administration Building

Chemistry and Life Sciences

Catalysis and Biocatalysis Technologies. To develop the tools, abilities, and

theoretical insight to identify, design, and

implement new catalytic and biocatalytic processes and catalyst manufacturing tech- niques of major economic importance to chemical producers and other catalyst users.

Contact: Robert Bloksberg-Fireovid

(301) 975-5457

email: robert.b-f@nist.gov A225 Administration Building

Manufacturing Composite Structures. To reduce the high initial costs of using advanced composite materials, traditionally found in military and sports applications,

through cost-effective manufacturing processes to enable the use of these highperformance, lightweight, durable materials

in large-scale commercial structural appli- cations such as surface transportation, civil

infrastructure, and offshore oil production.

Contact:

Felix Wu

(301) 975-4685

email: felix.wu@nist.gov A225 Administration Building

Selective-Membrane Platforms. To

develop the combination of materials sci- ence and manufacturing technology advances needed to create new families of membrane materials and process technologies for advanced high-selectivity, highthroughput chemical separations (including concentration and purification), producing

feedstocks for areas as diverse as pharmaceuticals and medical diagnostics, automobile

parts, consumer electronics, clothing, and

alternative fuels.

Contact: David King

(301) 975-2369

email: david.king@nist.gov A426 Administration Building

Tissue Engineering. To enable dramatic

advances in the development and use of bio- compatible materials, with or without a cellular component, to replace damaged or

defective tissues and organs. The program

concentrates on four key areas: biomaterials, cellular components (including largescale culturing techniques and genetic or environmental manipulation), manufacturing processes, and implantation and trans- plantation technologies.

Contact: Rosemarie Hunziker

(301) 975-5324

email: rosemarie.hunziker@nist.gov A225 Administration Building

Tools for DNA Diagnostics. To develop

compact, low-cost, automated DNA analysis

technologies and equipment to enable fast, inexpensive detection and diagnosis of human, animal, and plant diseases. Other

applications include personal identification,

toxicology, environmental monitoring, and

bioprocessing.

Contact:

Stanley Abramowitz

(301) 975-2587

email: stanley.abramowitz@nist.gov A225 Administration Building

Materials and Manufacturing

Materials Processing for Heavy

Manufacturing. To develop and demonstrate innovative materials-processing

technologies that will help U.S. heavy

manufacturing companies make longer lasting, more reliable, and more efficient products. The program concentrates on three major commercial markets: engines, power

trains, and chassis for surface vehicles; heavy equipment for construction, agriculture, mining, and oil fields; and engines,
0 ADVANCED TECHNOLOGY PROGRAM

turbines, rotors, and related components for power generators.

Contact:

Clare Allocca (301) 975-4359

email: clare.allocca@nist.gov A225 Administration Building

Microelectronics Manufacturing

Infrastructure. To develop new infrastructure technologies in materials, design,

manufacturing, and testing and to enable

strategic advances in semiconductor chips,

processes, packaging, and board interconnections. These technologies have been identified in several industry roadmaps as

potentially serious barriers to developing the

smaller, lighter, faster, and more costeffective microelectronic products demanded

by world markets.

Contact: Michael Schen

(301) 975-6741

email: michael.schen@nist.gov A225 Administration Building

Purabi Mazumdar

(301) 975-4891

email: purabi.mazumdar@nist.gov

A426 Administration Building

Motor Vehicle Manufacturing Technology. To foster innovations in manufacturing technologies that can strengthen

capabilities and lead to dramatic advances along the entire automotive production

chain, including more versatile equipment,

better control and integration of processes, and greater operational flexibility at all levels. Automotive suppliers are key partners and players in this program.

Contact: Jack Boudreaux

(301) 975-3560

email: jack.boudreaux@nist.gov A225 Administration Building

Premium Power. To develop advanced

electric power technologies, including photovoltaic solar arrays, integrated fuel cell sys- tems, advanced batteries, ultracapacitors, and flywheels, to support modular, highquality, highly distributed power sources

required for developing technologies in broadband wireless telecommunications,

portable electronics, and power-qualitysensitive industries.

Contact: Gerald Ceasar

(301) 975-5069

email: gerald.ceasar@nist.gov A225 Administration Building

Vapor Compression Refrigeration

Technology. To develop more efficient,

quiet, and compact air-conditioning and

refrigeration systems with the lowest achievable environmental impact. The projects

selected focus on improving the vapor compression cycle, the principle of operation for most current cooling equipment. The overall technical goals are to increase system

efficiency, reduce noise levels, and reduce

refrigeration components' sizes—each by

25 percent—and to design and manufacture systems in which no refrigerant leaks.

Contact: John Gudas

(301) 975-3214

email: john.gudas@nist.gov A225 Administration Building

Proposing a Focused

Program

The ATP reviews its portfolio of focused prog- rams annually and encourages interested groups in industry, academia, and govern- ment to submit ideas suggesting new

focused program areas. Potential focused programs are evaluated against four basic

criteria:

• The potential for broad economic benefits

to the nation. How would the proposed tech- nological developments lead to significant

economic benefits for the nation? How

would this be reflected in integrated research and business strategies? What

would be the likely effect on the U.S. workforce if the program succeeds and is carried forward to commercialization—taking into account national and international trends? How important to the economy are the

industrial sectors that would be most

affected by the program area? Would the proposed program create new industries or cause a leap forward in a well-established

industry?

• Good technical ideas. The ATP emphasizes revolutionary changes, not incre- mental advances. What is the technology

baseline for the proposed program? Given

current research trends in government and

industry, where would that technology be in the next 5 years to 10 years without an ATP

program? How will this be accelerated or changed by establishing an ATP program?

What are the major technical barriers to be overcome? Which innovative technologies

will erase those barriers? Where are the tech- nology risks that require ATP support?

• Strong industry commitment. The ATP is

a partnership between industry and govern- ment and cannot succeed without industry's whole-hearted support. What is the evidence

that industry is ready and willing to work

with the ATP and with one another as needed to achieve the program's goals? Would the program require horizontal alli- ances? Vertical alliances? Both? Are the industry players prepared to build these relationships? What resources would the industry be willing to commit to the program?

Are the potential industry partners willing to share the costs of the R&D?
ADVANCED TECHNOLOGY PROGRAM n

• The opportunity for ATP funding to make

a significant difference. In other words, why

the ATP? What related efforts are under way,

either by industry or government? How

would the ATP program complement these

efforts? Why is federal funding in general, and ATP funding in particular, needed to achieve the large potential economic benefit

to the nation? What is the international competition? Is time of the essence? Can we

realistically hope to meet the program

goals? Will the combined industry and gov- ernment funding be adequate to exploit the technological opportunity in the critical time frame? If the program is successful,

will our relatively small investment lead

to far greater investment by industry in subsequent development and

commercialization?

For more information on submitting

focused program ideas, visit the ATP web site (www.atp.nist.gov) or use one of the other

contact points listed in this chapter.

Delivering Results

From a remarkable new microcircuit solder- ing system based on the same principles as

the ink-jet printer, to power-transmission

towers made of durable, high-performance

composites, to the dramatic DNA "chips"

that enable rapid, low-cost, DNA analyses, the ATP already is having an impact, deliver- ing new technologies that would not exist here and now without the ATP (see An ATP

Project Sampler on page 7).

But the true impacts of the ATP will be felt

in the long run as ATP-fostered technologies

enter the market. Long-term evaluation of the ATP must take into account the "downstream" effects of these technologies: higher

productivity and lower reject rates for manufacturers using new processes and equip- ment based on ATP technologies; better medical care at lower costs from hospitals and clinics that benefit from ATP biotechnol- ogy projects or the ATP focused programs on

Tools for DNA Diagnostics and Information

Infrastructure for Healthcare; and longerlived, lower-maintenance structures and

equipment made possible by ATP focused programs in advanced composites. The

value of such long-range effects, though

real, are difficult to measure accurately.

Since its inception, the ATP has made eco- nomic evaluation of the outcomes of ATP

projects a central element of its operations.

The ATP has developed and implemented a thorough measurement program that pushes the state of the art in evaluating the long-term outcomes of R&D investment.

This is a lengthy process. ATP projects typically run from 2 years to 5 years; the tech- nology commercialization and diffusion phase easily can add several more years. The

full economic impact may not be realized

for some years after commercial introduction. It also is costly—companies must

spend additional time, effort, and money on

their own to pursue product development and marketing. Because of the risks involved—commercial as well as technical—some ATP projects will fail. Others may proceed faster than anticipated, and

intermediate results may lead to marketable

products even before the ATP project ends. Regardless of whether initial commercialization takes place before an ATP project ends

or long after, the company must invest its own money to design specific products incor- porating the technology and pay any other

costs associated with commercialization.

The ATP is contributing a new element to

the R&D culture of U.S. business—one that emphasizes more high-risk, high-payoff,

enabling R&D and greater use of cooperative research ventures and industrial alliances. Studies conducted both by the ATP

and by private contractors have documented

several important near-term results of the program:

• Successful ATP technologies represent not simply incremental advances but rather significant innovations that have broad application. A study of more than 200 ATP

projects—most still in progress—found

that the companies surveyed had identified more than 1,000 potential applications of

the ATP-supported technologies. Thirty-five percent of those are considered by project

participants to be "new-to-the-world" solutions to a market need or problem with the

potential to create totally new markets. Another 29 percent were expected to result in performance improvements of 100 percent

to 500 percent over the state of the art.

• The ATP successfully catalyzes high-risk

research. Surveys of ATP participants consistently find that a substantial percentage

70 percent in one study—would not have

attempted the ATP project without the ATP. Those that would have gone forward anyway

report significantly increased levels of effort and an often dramatic acceleration in progress due to the ATP. In one study, 86 percent

of project respondents reported that the ATP

support cut their estimated development

time by one-half or more—which translated to economic impacts ranging from a million to several billions of dollars for each

year gained according to some respondents—and a similar percentage reported

that they had adopted ATP practices to other

research projects to capitalize on these

gains. The bottom line: U.S. industry today has important new technical capabilities

that would not exist without the ATP.
ADVANCED TECHNOLOGY PROGRAM

• The ATP contributes to a valuable new

culture of cooperation in U.S. industrial R&D. In one study of more than 400 organizations working on ATP projects, nearly 80

percent reported that they were working on

the project in collaboration with other companies, universities, or federal labs, and 85

percent of these reported that the ATP played

a significant role in bringing the collaborative relationship together. In another study,

of 1 15 companies working collaboratively on ATP projects, 95 percent reported a

"significant benefit" from the ATP-inspired

collaboration—some companies even

participating without funding for the sake of the benefits—and 96 percent of

joint venture participants reported that the ATP experience encouraged them to seek

other joint ventures in the future.

The results of ATP-sponsored research, commercialized by private industry, are starting

to emerge from laboratories and enter the marketplace—potential impacts becoming

actual.

• One of the earliest ATP projects, a collaborative effort to develop a suite of advanced manufacturing technologies for the printed

wiring board (PWB) industry, resulted in new materials, testing, imaging, and production techniques that have been credited by

the National Center for Manufacturing Sciences, a participant, with "quite literally sav- ing" the roughly $7 billion U.S. PWB

industry, with its approximately 200,000

jobs.

• An ATP joint venture in the auto industry

that included several small and mid-sized manufacturers and universities resulted in manufacturing monitoring and control tech- nologies that led to significantly improved

dimensional tolerances, improving vehicle

quality and customer satisfaction. One

theoretical economic analysis of the project

projected that a market-share boost for U.S. auto manufacturers as a result of the ATPsponsored work could lead ultimately to thousands of new jobs and a $3 billion increase to the U.S. industrial output by the year 2000.

• The ATP was instrumental in promoting

the research that led to today's "DNA chips," miniaturized genetics labs that offer fast

up to 1000 times faster than conventional methods—accurate, low-cost genetic analysis. Early spin-offs of ATP projects in this area already are being used in agriculture and food and cosmetics testing as well as the obvious applications in drug discovery,

human-genome research, and biomedical

research.

Charged with monitoring and analyzing

both the short-term performance and long- range impacts of the program, the ATP's Economic Assessment Office employs a variety of research tools. Third-party surveys and in-depth case studies of individual projects look at such issues as the near-term impact of the ATP on participating companies and efficiencies from collaborative research and development. An innovative computerized business reporting system

facilitates statistical analysis by researchers and supplements site visits and annual

reviews to track project progress toward

future applications of the ATP technologies.

Other studies attempt to measure "spillover"

benefits and costs—those that accrue to users of the technology beyond the ATP participating companies. The ATP also sponsors

studies to increase the understanding of

spillover mechanisms in the economy and

to develop improved methods for measuring

the long-term impact of the program. ATP

periodically holds workshops with the nation's leading economists to discuss evaluation models, results, and opportunities. A

variety of ATP economic reports may be read

online at www.atp.nist.gov/atp/pubs.htm.

Contacting the ATP

The ATP accepts project proposals only in response to specific, published solicitations. Notices of ATP competitions are published

in Commerce Business Daily. You also may request to be placed on a mailing list

(or emailing list) to receive notification of ATP competitions and other events by call- ing the ATP automated hotline (1-800-ATPFUND or 1-800-287-3863) or by sending email to atp@nist.gov.

The ATP Proposal Preparation Kit may be

requested at any time. In addition to the necessary application forms, the kit includes

a thorough discussion of ATP goals and

procedures as well as useful guidance in the preparation of a proposal. Notices of ongoing competitions, upcoming events, ATP research papers, and descriptions of ongoing and completed ATP projects may be found on the program's web site.

Contact: Advanced Technology Program

1-800-ATP-FUND (1-800-287-3863)

email: atp@nist.gov

fax: (301) 926-9524 or (301) 590-3053 A407 Administration Building

www.atp.nist.gov
ADVANCED TECHNOLOGY PROGRAM 13

ATP Projects

Ongoing and completed ATP projects and

their participants are listed below, sorted

into related technical categories. The ATP

manages projects through three technical

offices: Information Technology and Electronics Office, Chemistry and Life Sciences

Office, and Materials and Manufacturing

Office.

The focused programs for which each office

is responsible are listed under each office's heading. Projects selected in focused prog- ram competitions are listed under the corresponding focused program. Projects

closely related to the subject of a focused program but selected in our general competitions are included in the focused program

listing. When the ATP selects a number of

projects in one particular area, such a cluster of projects is managed for synergy as a

"virtual focused program" even though

there has not been a formal competition in

that technical area.

General competition projects that do not fit within a focused program category are listed

separately, grouped in appropriate technical

categories. For information, contact the

office under which the project is listed.

Information Technology and

Electronics Office

Contact:

Cita Furlani

(301) 975-3543

email: cita.furlani@nist.gov A426 Administration Building

Component-Based Software

Contact: Barbara Cuthill

(301) 975-3273

email: barbara.cuthill@nist.gov A426 Administration Building

Creating New Software Development

Paradigms

• A Plausible Dependability Model for Component-Based Software—Reliable Soft- ware Technologies

• A Programmable Framework Based on

Semantic Modeling Components—Synquiry

Technologies, Ltd.

• Component Integration: An Architecture- Driven Approach—Andersen Consulting, Center for Strategic Technology Research

• Cost-Based Generation of Scalable, Reliable, Real-Time Software Components

HyBrithms Corp. (formerly Sagent Corp.)

• Design Maintenance System—Semantic

Designs, Inc.

• MirrorBall: A Component Infrastructure

Initiative—Sterling Software, Inc.

• Reusable Performance-Critical Software Components Using Separation of Implementation Issues—Xerox Corp., Palo Alto Research Center

Enhancing the Capabilities ofApplication

Experts

• A Component Technology for Virtual

Reality Based Applications—Aesthetic Solutions

• A Component-Based Software Approach to Analog and Mixed Signal Model Develop- ment—Analogy, Inc.

• Automatic Generation of Mathematical Modeling Components—SciComp, Inc.

• Automation of Dependable Software Generation with Reusable Components—Lucent

Technologies, Inc.

• Component-Based Software for Advanced

Interactive Systems in Entertainment and

Education—Extempo Systems, Inc.

Automating the Software Development

Process

• Business Object Component Specification, Generation and Assembly—Data Access Technologies, Inc.

• Component-Based Re-engineering Technology—Reasoning Systems, Inc.

• Component-Based Software System for

Parallel Processing Systems—Applied

Parallel Technologies, Inc.

• Component-Based Software Tools for Real-Time Systems—Real-Time Innovations, Inc.

• Debugging Component-Based Software

for Enterprise Systems—Intermetrics, Inc.

• Graph Visualization Technology—Tom

Sawyer Software

• Scalable Business Application Develop- ment Components and Tools—Continuum

Systems

Digital Data Storage

Contact:

Philip Perconti

(301) 975-4263

email: philip.perconti@nist.gov A426 Administration Building

Optical Recording Technology

• A High-Density and High-Speed Read- only Optical Data Storage System

Calimetrics

• A Novel Flying-Optical-Head Disk Drive

Quinta Corp.* and SDL, Inc.

• Continuous Low-Cost Manufacturing

System for DVD—Energy Conversion

Devices, Inc.

• Digital Data Storage Technology via Ultrahigh-Performance Optical Tape Drive Using a Short-Wavelength Laser—LOTS

Technology, Inc.

• Enabling Technology for a Digital Video

Optical Tape Recorder of High-Resolution Motion Imagery—Avid Technology, Inc.; EMC Corp.; LOTS Technology, Inc.*; Lucent

Technologies; and Polaroid Corp.

• Multiple Optical Recording Enhancements—Calimetrics, Inc.; Energy Conversion Devices, Inc.; National Storage Industry Consortium*; and Polaroid Corp.

*Joint venture lead partner
ADVANCED TECHNOLOGY PROGRAM

• Short-Wavelength Sources for Optical

Recording—Carnegie Mellon University, ECE Department; Eastman Kodak Co., Mass Memory Division, Research Labs; IBM Corp., Almaden Research Center; National Storage

Industry Consortium*; Uniphase; and

University of Arizona, Optical Science Center

• Technology Development for OpticalTape-Based Rapid Access Affordable Mass

Storage—Carnegie Mellon University; Energy Conversion Devices, Inc.; Motorola,

Inc., Phoenix Applied Research Center; NASA

Goddard Space Flight Center; Polaroid

Corp.; Science Applications International

Corp.; Terabank Systems, Inc.*; University

of Arizona, Optical Sciences Center; and

Xerox Corp.

Magnetic Recording Technology

• High-Performance, Variable-Data-Rate,

Multimedia Magnetic Tape Recorder

Advanced Research Corp.; Imation Corp.*; Seagate Recording Head, Tape Head Operations; and Storage Technology Corp.

• Integrated Vacuum Lubrication System

for Hard Disks—Intevac, Inc.

• Trainable Digital Logic: A New Approach

to Increasing Data Storage Density on Magnetic Media—Neural Systems Corp.

• Ultra-High Density Magnetic Recording Heads—Applied Magnetics Corp.; Carnegie Mellon University, ECE Department, Data

Storage Systems Center; Eastman Kodak Co.; George Washington University, Department

of Electrical Engineering and Computer

Science; Hewlett-Packard Co.; IBM Corp., Almaden Research Center; National Storage

Industry Consortium*; Quantum Corp.; Read-Rite Corp.; Seagate Technology; Stanford University, Department of Materials Sci- ence and Engineering; Storage Technology

Corp.; University of Alabama at Tuscaloosa, Center for Materials Information Technology; University of California at San Diego, Center for Magnetic Recording; University of Minnesota, Electrical Engineering and Computer Science; and Washington University, Department of Electrical Engineering

Digital Video in Information Networks

Contact: David Hermreck

(301) 975-4328

email: david.hermreck@nist.gov A426 Administration Building

Information Capacity Improvementsfor

Transmission and Distribution

• Adaptive Video Codec for Information Networks—Cubic VideoComm, Inc.

• Mobile Information Infrastructure for

Digital Video and Multimedia Applications

Lucent Technologies, Inc.* and Sun Microsystems Federal, Inc.

• Perceptual-Based Video Encoding and

Quality Measurement—Bell Atlantic; Sarnoff Corp.*; Sun Microsystems Computer

Corp.; and Texas Instruments, Inc.

Interoperable System Components

• HDTV Broadcast Technology—Comark

Communications, Inc.; IBM Corp., T.J. Watson Research Center; MCI; Philips Research; Sarnoff Corp.*; Sun Microsystems

Computer Corp.; and Thomson Consumer

Electronics, Inc.

• Interoperability Tools for Digital Video Systems—Bell Communications Research,

Inc.

Digital Video Tools and Management

Capabilities

• Advanced Distributed Video ATM Network

for Creation, Editing, and Distribution

Tektronix, Video and Networking Division

Information Infrastructure for Healthcare

Contact:

Bettijoyce B. Lide (301) 975-2218

email: bettijoyce.lide@nist.gov A426 Administration Building

Infrastructure Development Technologies

(Enterprise Integration)

• An Evolvable, Distributed Information

Infrastructure for Interoperation of the Healthcare Delivery System—Andersen

Consulting, Center For Strategic Technology

Research*; Enigma Logic, Inc.; Expersoft

Corp.; MedicaLogic; Medical Records Corp.; and University of Texas at Arlington, Auto- mation Engineering

• An Expert Knowledge Server With a General Vocabulary Server Interface—Mosby Consumer Health (formerly Applied Medical)

• Development of a Seamless Clinical Management System for Behavioral Health

Organizations—InStream Corp.

• Enterprise Tools for the Continuously

Available Medical Care Home Healthcare System—Intermetrics, Inc., Microcomputer

Systems Division

• Healthcare Lifetime Data Repository

Infrastructure—3M Co., Health Information

Systems

• A Master Patient Index for Massively

Distributed Records Across a U.S. National Backbone—Sequoia Software Corp.

• "MEDencode": A Technology to Populate

a Clinical Data Repository as a Byproduct of Producing the Clinical Note—Clinical Infor- mation Advantages, Inc.

• Patient-Oriented Management System: An Integration Infrastructure for Health Care—Benchmarking Partners, Inc.

• Voyager: Browsing and Automatically

Extracting Healthcare Data from Scattered Databases—Belmont Research, Inc.

Infrastructure Development Technologies

(Domain Analysis and Business Process Re-engineering)

• An Information Infrastructure to Redefine Caregiver Roles: A New Approach to Integration—Health Data Sciences Corp.* and New York City Health and Hospitals Corp.

• Health Informatics Initiative—Beth

Israel Hospital; Booz-Allen and Hamilton,

Inc.; Corporation for Studies and Analysis;

D. Appleton Company, Inc.; International Cancer Alliance; Koop Foundation, Inc.*;

"'Joint venture lead partner
ADVANCED TECHNOLOGY PROGRAM 15

Meta Software Corp.; Oracle Corp.; and Wizdom Systems, Inc.

• Healthcare Information Infrastructure Technology Proposal—BellSouth Telecommunications; Coleman Information Services, Health Technology Group; Connecticut

Healthcare Research and Education; Danbury Health Systems, Inc.; General Electric Corporate R&D; Liberty Health Systems; Medical University of South Carolina, Center

for Computing and Info. Tech.; Microelectronics & Computer Technology Corp.; New

Jersey Institute of Technology; South Carolina Research Authority, Trident Research

Center*; Statewide Health Information Net- work, Inc. (SHINE); Unitron Medical Communications, Inc.; and University of Georgia, Sponsored Programs Program

Office

Infrastructure Development Technologies

(Total Quality Management)

• Automated Care Plans and Practice Guidelines—American Healthware Systems

• Development of an Episode Grouper—3M

Co., Health Information Systems* and Actuarial Sciences Associates

• MEDassist: A Generalized ComponentBased Technology to Serve as a Foundation

for Decision Support Systems—Datamedic

• Methodologies for Automating Clinical

Practice Guidelines—Cerner Corp.

• Rxlnfo: Data Mining Tools for Assessing

the Impact of Pharmaceutical Therapies on

Population-Based Healthcare Outcomes

CHIME, Inc.

User Interface and EfficiencyEnhancement Technologies (Information

Access, Transmission, Storage, and

Retrieval)

• Computer Aided Medical Planning: A New

Paradigm in Vascular Intervention

Centric Engineering Systems, Inc.

• Decision Support Technology for LDR

Infrastructure—3M Co.

• Development of National Medical Practice Knowledge Banks—AT&T Corp., Business Markets Division; Allegheny-Singer Research Institute*; and NCR Corp., Parallel Systems (formerly AT&T)

• Health Object Library ON-line Project

Agora, Inc.; At Home Network; Beth Israel Hospital Deaconess Medical Center; Concept

Five Technologies; Forefront Group, Inc.; George Washington University, School of Engineering; IntelliTek, Inc.; Koop Foundation, Inc.*; Lumina Decision Systems; Meta

Software Corp.; Norwalk Hospital, Center for Health Informatics; Oracle Corp.; Windom

Health Enterprises; and Wizdom Systems,

Inc.

• Healthcare Information Technology

Enabling Community Care—Advanced Radiology; BellSouth Telecommunications;

Charleston Area Medical Center, Inc.; Connecticut Healthcare Research and Education; General Electric Corporate R&D; Lock- heed Martin Energy Systems, Inc.; Shared

Medical Systems Corp.; South Carolina Research Authority*; Technology 2020; University of Florida at Gainesville, Department

of Anesthesiology; and University of Maryland at Baltimore, Diagnostic and Radiology

• Physician's Assistant for Continuous Transcription and Structure—Kurzweil Applied

Intelligence

• Pre Op: The Pre-Operative Decision Support System—HT Medical Systems, Inc.

User Interface and Efficiency- Enhancement Technologies (Multimedia

Information)

• A Multimedia Medical Dialog System for Home Healthcare—Dragon Systems, Inc.

• A Three-Dimensional Database for Visualization of Human Physiology—Engineering Animation, Inc., and Iowa State

University Research Park

• Automating Disease Surveillance from

Structured and Text Data—Sunquest Infor- mation Systems

• Intelligent Spoken Medical Records

Berdy Medical Systems

• Open, Voice-Enabled, Structured Medical Information—Kurzweil Applied Intelli- gence, Inc.

• TELEOSTM: An Authoring System

for Virtual Reality Surgical Simulations

HT Medical, Inc. (formerly High

Techsplanations)

• WellnetTM: An Interactive Multimedia Consumer Health Management Tool

CareSoft, Inc.

Technologies for the Integration of Manufacturing Applications

Contact: Selden Stewart

(301) 975-3833

email: selden.stewart@nist.gov A426 Administration Building

• A Product-Family-Based Framework for Computer Integrated Manufacturing—IBM

Corp.

• ANTS Scheduling and Execution Sys- tem—Deneb Robotics, Inc.

• Advanced Process Control Framework

Initiative—Advanced Micro Devices and

Honeywell, Inc., Technology Center*

• Agent-Enhanced Manufacturing System

Initiative—Advanced Micro Devices* and

Object Space, Inc.

• An Agent-Based Framework for Integrated

Intelligent Planning-Execution—Berclain USA Ltd.; EnVisionlt Software Corp.; IBM

Manufacturing Solutions Unit, CIIMPLEX*;

Ingersoll-Rand Co.; Intercim Corp.; and

QAD, Inc., Americas Regional Office

• Distributed Factory System Framework

Consilium, Inc.

• EECOMS: Extended Enterprise Coalition

for Integrated Collaborative Manufacturing

Systems—Berclain USA Ltd.; Enterprise

Engines, Inc.; Envisionit Software Corp.; IBM Corp., CIIMPLEX*; Ingersoll-Rand Co.; Intercim Corp.; QAD, Inc.; Scandura; The

'Joint venture lead partner
ADVANCED TECHNOLOGY PROGRAM

Haley Enterprise, Inc.; and Vitria Technology, Inc.

• Model-Driven Application & Integration

Components for MES—Vitria Technology,

Inc.

• Process Integration Using Model-Driven

Engines—Vitria Technology, Inc.

• Solutions for MES-Adaptable Replicable

Technology—AMP, Inc.; Applied Automation Techniques, Inc.; CIMLINC; Concentus Technology Group; IBM Corp. (NIIIP Consortium Project Office)*; Industrial Computer Corp.; International TechneGroup,

Inc.; MESA International; Pilot Industries,

Inc.; STEP Tools, Inc.; SynQuest; and University of Florida at Gainesville, Database

Systems R&D Center

• Virtual Reality Telecollaborative Inte- grated Manufacturing Environment—Searle

General Projects Related to Information Technology

Contact:

Cita Furlani (301) 975-3543

email: cita.furlani@nist.gov A426 Administration Building

• A National Knowledge Infrastructure

Cycorp, Inc.

• Advanced Spoken Language User Interfaces for Computer Applications—Kurzweil

Applied Intelligence, Inc.

• Building a Future Database—Continuum

Software, Inc.

• High-Fidelity Digital Image Compression—Iterated Systems, Inc.

• New User Interface for Computers Based on Online Recognition of Natural Handwriting—Communication Intelligence Corp.

• Optical Maximum Entropy Verification Technology for Anti-Counterfeiting

Physical Optics Corp.

• Pen-Based User Interface for the Emerging Chinese Computer Market—Communication Intelligence Corp.

General Projects Related to Electronics and Photonics

Contact:

Cita Furlani

(301) 975-3543

email: cita.furlani@nist.gov A426 Administration Building

Displays and Graphic Image Manipulation

• Advanced Manufacturing Technology for Low-Cost Flat-Panel Display—Electro- Plasma, Inc.; Kent Display, Inc.; Photonics Imaging, Inc. (American Display Consortium)*; Planar America, Inc., Division of Planar Systems; and Westinghouse Norden Systems, Inc., Division of United Technologies

• Color Sequential Imaging—ColorLink,

Inc.

• Diamond Diode Field Emission Display

Process Technology Development—SI Dia- mond Technology, Inc.,* and Supertex, Inc.

• FLC/VLSI High-Definition Image Generators—Displaytech, Inc.

• High Information Content Display Technology—Kopin Corp.* and Philips Con- sumer Electronics North America

• High Resolution Multimedia Laser

Projection Display—Laser Power Corp.* and Proxima Corp.

• Large Area Digital HDTV Field Emitter Dis- play Development—FED Corp.

• Mathematical Algorithms and Software

for the Restoration and Reformatting of Moving Pictures—Mathematical Technologies,

Inc.

• Optically Controlled Alignment Materials

for Liquid-Crystal Displays—Alliant Techsystems, Research Center (technology transferred to Elsicon, Inc.)

• Patterning Technology for Color Flat- Panel Displays—Electro-Plasma, Inc.; Kent

Display, Inc.; Photonics Imaging, Inc.; and

Planar America, Inc., Division of Planar Sys- tems (American Display Consortium)*

• Scalable High-Density Electronics Based on MultiFilm Modules—Kopin Corp.* and

Microelectronics & Computer Technology

Corp.

• Technology Development for the Smart

Display: A Versatile High-Performance Video

Display Integrated with Electronics

B.F. Goodrich Avionics Systems; FED Corp.*; InfiMed, Inc.; and Kaiser Electronics

Semiconductor Devices, Materials, and

Fabrication

• A Feedback-Controlled Metalorganic

Chemical Vapor Deposition Reactor—Spire Corp.

• Advancement of Monocrystalline Silicon Carbide Growth Processes—Cree Research,

Inc.

• Critical Components for Process Control

in Microelectronics Manufacturing—ADE

Corp.; Advanced Fuel Research, Inc.; Applied

Materials, Inc.; Massachusetts Institute of Technology; and On-Line Technologies,

Inc.*

• Development of Blue/Green Emitters

Utilizing Homoepitaxial ZnSe-Based

Heterostructures—Eagle-Picher Research

Laboratory

• Dry Gas-Phase Cleaning Technology for Single-Wafer Surface Conditioning—FSI

International, Inc.

• Fabrication and Testing of Precision

Optics for Soft X-ray Projection Lithography—Lucent Technologies, Inc. (formerly

AT&T Bell Laboratories)

• Flip Chip Monolithic Microwave Inte- grated Circuit Manufacturing Technology

Hughes Aircraft Co., Microelectronic Circuits Division

• GaAs Super Microprocessor Technology

Development—Vitesse Semiconductor

Corp.

• Manufacturing Technology for High Per- formance Optoelectronic Devices Based on

Liquid Phase Electro-Epitaxy—AstroPower,

Inc.

*Joint venture lead partner
ADVANCED TECHNOLOGY PROGRAM

• New Technology for High-Current,

Parallel, Broad-Beam Implanters for Microelectronics Fabrication—Diamond Semiconductor Group, Inc.

• Nonvolatile Magnetoresistive Semiconductor Technology—Nonvolatile Electronics,

Inc.

• Solid-State Laser Technology for Point- Source X-ray Lithography—Hampshire

Instruments, Inc.*, and McDonnell Douglas

Electronic Systems Co.

Optical/Electro-optical Components and

Systems (Including Lasers)

• A Novel Microminiature Light Source Technology—Philips Laboratories

• Advanced Technology for MicroChannel

Plates—Galileo Electro-Optics Corp.

• Fiber Fabry-Perot Tunable Filters for AllOptical Networks—Micron Optics, Inc.

• Holographic Graded-Index NonLambertian Scattering Screens and Components with Light-Shaping Capability

Physical Optics Corp.

• Incoherent Combining of Radiation from

a Two-Dimensional Array of Semiconductor

Lasers—Cynosure, Inc.

• Jitney: A Low-Cost, High-Performance

Optical Bus—3M Co.; IBM Corp., T.J. Watson Research Center*; and Lexmark

International, Inc.

• Monolithic Multiwavelength Laser Diode

Array Spanning 430 to llOOnm—SDL, Inc.* and Xerox Corp., Palo Alto Research Center

• Precision Optoelectronics Assembly

Adept Technology, Inc.; Boeing Co., Infor- mation, Space & Defense Systems; Dresser

Industries, Inc., Instrument Division; MultiLifecycle Engineering Research Center, New Jersey Institute of Technology; Preci- sion Optoelectronics Assembly Consortium

(c/oNCMS)*;and SDL, Inc.

• Tunable Deep UV and VUV Solid-State Laser Source—Light Age, Inc.

• Wavelength Division Multiplexing for Optical Telecommunications Systems

Accuwave Corp.

• X-ray and Neutron Focusing and Colli- mating Optics—X-ray Optical Systems, Inc. New Materials/Manufacturingfor

Electronics and Electrical Systems

• Integrated Force Array—Microelectronics Center at North Carolina

• Printed Wiring Board Interconnect Sys- tems—AlliedSignal Laminate Systems; Hughes Aircraft Co.; IBM Corp.; Lucent Technologies, Inc. (formerly AT&T); National

Center For Manufacturing Sciences, Inc.*; Sandia National Laboratories; Texas Instru- ments, Inc.; and United Technologies Corp., Hamilton Standard Division

Superconducting Systems and Devices

• Advanced Thallium Superconductor Technology—DuPont

• High-Temperature Superconducting Racetrack Magnets for Electric Motor Applications—American Superconductor Corp.

• Hybrid Superconducting Digital System

Conductus, Inc.*; National Institute of Standards and Technology; Stanford University, Department of Applied Physics; TRW

Applied Technology Divison, Space and

Technology Group; and University of Califor- nia at Berkeley, Department of Electrical Engineering and Computer Science

• Technologies for HTS Components for Magnetic Resonance Applications—DuPont,

Superconductivity Group and Intermagnetics General Corp.*

• Thick-Film Superconducting Materials

for Radiofrequency Communications

Illinois Superconductor Corp.

Other Electronics, Electrical, and

Photonics Projects

• Advanced Cathode for Flat Fluorescent

Light Sources—Thomas Electronics, Inc.

• High Performance ASIC Technology for

Digital Signal Processing—The Athena

Group, Inc.

• Low Dielectric Foams for Microelectronics

Applications—IBM Corp., Almaden

Research Center

• Polymeric Switches for Optical Interconnects—IBM Corp., Almaden Research Center

Chemistry and Life Sciences

Office

Contact: Linda Beth Schilling

(301) 975-2887

email: linda.schilling@nist.gov A225 Administration Building

Catalysis and Biocatalysis

Contact: Robert Bloksberg-Fireovid

(301) 975-5457

email: robert.b-f@nist.gov A225 Administration Building

• A Process for Biocatalytic Desulfurization

of Crude Oil —Energy BioSystems Corp.

• Biosynthesis of Monomers—General Electric Corporate R&D

• Breakthrough Process for Direct Oxidation of Propylene to Propylene Oxide—Dow

Chemical Co.

• Breakthrough Technology for Oxidation

of Alkanes—Rohm and Haas Company,

Inc., Research Laboratories and Sun Company, Inc. (R&M)*

• Computational Methods for Catalyst Design—Phillips Petroleum Co., Corporate

Technology

• Continuous Biocatalytic Systems for the Production of Chemicals from Renewable

Resources—Argonne National Laboratory; Eastman Chemical Co.; Electrosynthesis

Company, Inc.; Genencor International,

Inc.*; and MicroGenomics, Inc.

*Joint venture lead partner
ADVANCED TECHNOLOGY PROGRAM

• Development of Improved Catalysts using Nanometer-Scale Technology—Catalytica,

Inc.* and Microfluidics International Corp.

• Direct Oxidation of Natural Gas to Methanol and Transportation Fuels—Catalytica,

Inc.

• Elastomeric Polypropylene and Elastic Non-wovens Venture—Amoco Corp., Resource Center* and Fiberweb North

America, Inc.

• New Zeolite Synthesis Technology

Chevron Research and Technology Co.

• Polar-Tolerant Organometallic Catalytic

Technology for Functionalized Linear Polyolefins—Grace Packaging (formerly W.R.

Grace)

• Tailored Optical Polymers Through a Novel Catalyst System—3M Co. and

B.F. Goodrich*

• Thin-Film Solid Acid Catalyst for Refinery

Alkylation—ABB Lummus Global, Inc.

• Three-Phase Circulatory Flow Reactor Technology for Vapor-Phase Organic Oxidations—Praxair, Inc., Applications for R&D

Manufacturing Composite Structures

Contact:

Felix Wu

(301) 975-4685

email: felix.wu@nist.gov A225 Administration Building

Technologiesfor Vehicles

• Automotive Composite Structures: Devel- opment of High-Volume Manufacturing

Technology—Chrysler Corp., Organic Materials Engineering; Ford Motor Co., Scientific Research Labs; General Motors (Automotive

Composites Consortium)*; and General Motors Corp., Polymers Department

• Cyclic Thermoplastic Liquid Composite

Molding for Automotive Structures—Ford Motor Co., Scientific Research Labs* and

General Electric Corporate R&D

• Development of Manufacturing Methodologies for Vehicle Composite Frames

Budd Co., Design Center

• Engineering Design with Injection- Molded Thermoplastics—General Electric Corporate R&D and General Motors Corp., Research and Environmental Staff*

• Integrated Agile Manufacturing for Advanced Composite Electric Vehicles

Advanced Product Development, Inc.; Black Emerald Group; Boston Edison Co.; Design

Evolution 4, Inc.; IBIS Associates; Lightbody

Technology, Inc.; Massachusetts Division of Energy Resources; Northeast Alternative Vehicle Consortium*; Pepin Associates, Inc.; Solectria Corp.; TPI, Inc.; and Thermal Wave Imaging, Inc.

• Low-Cost Advanced Composite Process for Light Transit Vehicle Manufacturing

Advance USA*; Dow Chemical Co.; Ford Motor Co.; and General Electric Co.

• Low-Cost Elastomeric Composites with

Application to Vehicle Tires—AlliedSignal,

Inc.

• Manufacturing Composite Flywheel Structures—Dow-United Technologies Composite

Products, Inc.

• Manufacturing Methodologies for Auto- mated Thermoset Transfer/Injection Molding—Budd Co., Design Center

• Vapor-Grown Carbon-Fiber Composites

for Automotive Applications—Applied Sciences, Inc.*; General Motors Corp., North American Operations R&D Center, Environmental; General Motors Delphi Chassis Sys- tems, Advanced Composite Engineering;

and Goodyear Tire & Rubber Co., Goodyear

Technical Center

Technologiesfor Offshore Oil Production

• Composite Production Risers—Amoco

Corp.; Brown & Root USA, Inc.; Conoco,

Inc.; Cullen Engineering Research Foundation (Composite Production Risers Joint Venture)*; Hexcel Corp.; Hydril Co.; Lincoln

Composites; Shell Exploration and Production Technology Co.; Stress Engineering

Services, Inc.; and University of Houston- CEAC

• Innovative Joining/Fitting Technology

for Advanced Composite Piping Systems

Specialty Plastics, Inc.

• Light-Weight/High-Strength Composite

Intelligent Flexible Pipe Development

Wellstream Corp.

• Manufacturing Composite Structures for the Offshore Oil Industry—ABB Vetco Gray,

Inc.; Hexcel Corp.; Northrop Grumman

Corp., Marine Systems Division*; Reading &

Bates Development Co.; Texaco, Inc./Deep

Star Project; and Texas Engineering Experi- ment Station, Offshore Tech. Res. Ctr. (University of Texas and Texas A&M)

• Spoolable Composite Tubing—Amoco

Corp., Resource Center; Cullen Engineering

Research Foundation (Spoolable Composite

Tubing Joint Venture)*; Elf Atochem North

America, Inc.; Hydril Co.; Phillips Petroleum

Co.; Shell Exploration and Production Technology Co.; and University of Houston-CEAC

Technologiesfor Bridges and Other Large

Structures

• High-Performance Composites for Large

Commercial Structures—Brunswick Technologies, Inc.; Dow Chemical Co.; Hardcore DuPont Composites, LLC.*; and Johns Hopkins University, Whiting School of Engineering

• Innovative Manufacturing Techniques

to Produce Large Phenolic Composite

Shapes—Strongwell Corp. (formerly Morri- son Molded Fiberglass)

• Low Cost Manufacturing and Design/ Sensor Technologies for Seismic Upgrade of Bridge Columns—Composite Retrofit Corp./Xxsys*; Hexcel Corp.; and TransScience Corp.

• Polymer Matrix Composite Power Trans- mission Devices—Hexcel Corp.; New Venture Gear, Inc.*; Quantum Composites of Midland; and Quantum Consultants, Inc.

•Joint venture lead partner
ADVANCED TECHNOLOGY PROGRAM 19

• Synchronous In-line CNC Machining of Pultruded Lineals—Ebert Composites

Corp.

Tissue Engineering

Contact: Rosemarie Hunziker

(301) 975-5324

email: rosemarie.hunziker@nist.gov A225 Administration Building

• Advanced Transgenic Model Systems for Biomedical Research and Development

Genencor International, Inc.

• Application of Gene Therapy to Treatment

of Cardiovascular Diseases—Progenitor, Inc.

• Biocompatible Resorbable Polymers

Designed for Tissue Engineering—Integra

LifeSciences Corp.

• Cardiac Muscle Regeneration Using

Mesenchymal Stem Cells—Osiris Therapeutics, Inc.

• Combinatorial Cell Culture: Tool Develop- ment and Application to Human Stem Cell Growth—Automated Cell Technologies, Inc.

• Computer-Integrated Revision Total Hip

Replacement Surgery—IBM Corp., T.J. Watson Research Center; Integrated Surgical

Systems, Inc.*; and Johns Hopkins University

• Development of Immortalized Human

Hepatocytes for Therapeutic Purposes

Multi-Cell Associates, Inc.

• Development of Tissue-Engineered Vascular Grafts Based on Quantitative Cell and Tis- sue Biomechanics—Advanced Tissue

Sciences, Inc.

• Disease Treatment Using Living Implantable Microreactors—BioHybrid Technologies, Inc.,* and Synergy Research Corp.

• Ex Vivo Production of Universal Red

Blood Cells and Platelets in a Biocompatible 3-D Tissue Scaffold—Cytomatrix

• Fabrication of Clinical Prosthesis from

Biomaterials—Tissue Engineering, Inc.

• Generation of Neural Stem Cell Implants

for Neurodegenerative Disease Therapies

CytoTherapeutics, Inc.

• High-Throughput Screening of Hardy

Cells for Encapsulation and Implantation

Therapies—CytoTherapeutics, Inc.

• Human Stem Cell and Hematopoietic

Expansion Systems—Aastrom Biosciences,

Inc.

• Molecular Approaches to Ice Control for Engineered Tissue Storage—Life Resuscitation Technologies, Inc.

• Structurally New Biopolymers Derived from Alpha-L-Amino Acids—Integra

LifeSciences Corp.

• Synthetic Nerve Fiber Guides Using Novel Biopolymers and Cellular Adhesion Molecules—Acorda Therapeutics, Inc.

• Three-Dimensional Fibrous Scaffolds for Tissue Engineering—Johnson & Johnson

• Treatment of Diabetes by Proliferated Human Islets in Photocrosslinkable Alginate

Capsules—VivoRx, Inc.

• Universal Donor Organs for Transplantation—Alexion Pharmaceuticals, Inc.

• Xenogeneic Cartilage Transplantation

Alexion Pharmaceutical, Inc.,* and United

States Surgical Corp.

Tools for DNA Diagnostics

Contact:

Stanley Abramowitz

(301) 975-2587

email: stanley.abramowitz@nist.gov A225 Administration Building

• A Portable Genetic Analysis System

Nanogen, Inc.

• An Integrated Microelectronic DNA Diagnostic System—Nanogen, Inc.

• Arrayed Primer Extension: The Next Generation DNA Analysis System for Sequencing

in DNA Diagnosis—Amersham Pharmacia

Biotech, Inc.*; Baylor College Of Medicine; Duke University, Department of Chemistry,

PM Gross Chemical Laboratory; and Identigene, Inc.

• Automated DNA Amplification and Frag- ment Size Analysis—DuPont, FQMS Group

• Compact Blue Laser for Diagnostics

Perkin-Elmer Corp., Applied Biosystems Divi- sion and Uniphase, Laser Division*

• DNA Diagnostic Systems Based on Novel Chem-jet Techniques—Combion,

Inc./Incyte Pharmaceuticals, Inc.

• DNA Diagnostics Using Self-Detected Target-Cycling Reaction—NAVIX, Inc.

• Development and Commercial Application of Genosensor-Based Comparative

Genome Hybridization—Vysis, Inc.

• Development of a Generic Technology for

the Targeted Detection and Cleavage of DNA

and RNA—Third Wave Technologies, Inc.

• Development of Bar Code Diagnostics for DNA Diagnostics—Vysis, Inc.

• Development of Rapid DNA Medical Diagnostics—GeneTrace Systems, Inc.

• Diagnostic Laser Desorption Mass Spec- trometry Detection of Multiplex Electro- phore Tagged DNA—Bruker Analytical Systems, Inc.*; Genome Therapeutics Corp.; and Northeastern University

• Generation and Development of Novel

Nucleic Acid Binding Proteins and Their Use

as DNA Diagnostics—Sangamo Biosciences

• Genosensor Technology Development

Baylor College of Medicine, Center for Biotechnology; Beckman Instruments; Genometrix, Inc.; Genosensor Consortium,

c/o Houston Advanced Research Center*; Genosys Biotechnologies, Inc.; Houston Advanced Research Center; Laboratories for Genetic Services, Inc.; Massachusetts Institute of Technology, USAF/Lincoln Laboratory; Microfab Technology, Inc.; and Triplex Pharmaceutical Corp.

• Hyperthermophilic Microorganisms in Molecular Biology and Biotechnology

United States Biochemical Corp.

"Joint venture lead partner
ADVANCED TECHNOLOGY PROGRAM

• Integrated Microfabricated Devices for DNA Typing—Molecular Tool, Inc., Alpha

Center

• Integrated Microfabricated DNA Analysis Device for Diagnosis of Complex Genetic

Disorders—CuraGen Corp.* and Soane

Biosciences, Inc.

• MicroLab: A High-Throughput, Low-Cost Approach to DNA Diagnostics by Array

Hybridization—Sarnoff Corp.

• Miniature Integrated Nucleic Acid Diagnostic (MINDTM) Development

Affymetrix, Inc.*, and Molecular Dynamics,

Inc.

• Molecular Cytogenetics Using the GeneScope: An Ultrafast, Multicolor System

for Automated FISH Analysis—Bio-Rad

Laboratories

• Programmable Nanoscale Engines for Molecular Separation—CuraGen Corp.

• Real-Time Micro-PCR Analysis System

Cornell University Medical College, Depart- ment of Microbiology; EG&G IC Sensors; Louisiana State University, Department of Chemistry; Perkin-Elmer Corp., Applied Bio- systems Division*; and University of Minnesota, Department of Chemistry

• SBH Format 3 Megabase Diagnostics Instrumentation—Hyseq, Inc.

• Self-Contained Cartridge Integrating Nucleic Acid Extraction, Specific Target

Amplification, and "Dip Stick" Immediate

Detection—Immunological Associates of Denver

• Simple, Generic, and Low-Cost Genetic- Based Tools for Disease Detection, Monitoring, and Intervention—Third Wave

Technologies, Inc.

General Projects Related to Chemistry and

Chemical Engineering

Contact: Linda Beth Schilling (301) 975-2887

email: linda.schilling@nist.gov A225 Administration Building

Separations Technology

• Advanced Sorbents for Reducing the Cost

of Oxygen—Praxair, Inc.

• Development of New Technologies for Treating and Recycling Wastewater from

Aquaculture Facilities—Aquatic Systems/

Kent SeaFarms Corp., Research Division

• Dual Purpose Ceramic Membranes—BP

Chemical, Inc.*, and Praxair, Inc.

• Energy-Efficient Oxygen Production Using Novel Ion-Transport Membranes—Air Products and Chemicals, Inc.

• Facilitated Transport Process for LowCost Olefin-Paraffin Separations—Amoco

Corp., Resource Center

• Non-Chromatographic Enantiomer Separation and Purification with High Separation Factors—IBC Advanced Technologies,

Inc.

• Novel Anion-Selective Separations Using

Molecular Recognition Technology—IBC Advanced Technologies, Inc.

Drug Design and Chemical Modeling

• Crystallization and Structural Determination of G-Coupled Protein Receptors

3-Dimensional Pharmaceuticals, Inc., Eagle View Corporate Center

• Development and Applications of Density Functional Software for Chemical and Bio- molecular Modelings—Biosym Technologies, Inc.

• Enhanced Molecular Dynamics Simulation Technology for Biotechnology Applications—Moldyn, Inc.

• Evolution of a Murine Model for AIDS:

Applications to Discovery of Small Molecule and Vaccine Therapeutics—Maxygen

• Fundamental New Strategies to Discover Drugs—Isis Pharmaceuticals

• Marine Microorganisms and Saline Fer- mentation: A New Industrial Resource

Aphios Corp.

• Molecular Recognition Polymers as AntiInfectives—GelTex Pharmaceuticals, Inc.

• Molecular Recognition Technology for Precise Design of Protein-Specific Drugs

CuraGen Corp.* and Wyeth-Ayerst Research,

American Home Products

• RNA Binding Protein Technology for

Identification of Novel Therapeutics

Bearsden Bio, Inc. (formerly Symphony

Pharmaceuticals)

Other Chemistry and Chemical

Engineering Projects

• Development of Improved Functional

Properties in Renewable-Resource-Based

Biodegradable Plastics—Cargill, Inc., Research Center

• Enabling Large-Scale Recovery of Plastics from Durable Goods—MBA Polymers

• Film Technologies to Replace Paint on

Aircraft—3M Co.* and Lockheed Martin

Corp., Aeronautical Systems

• Plasma and Phosphor Technology for Mercury-Free Fluorescent Applications

General Electric Corporate R&D

General Projects Related to Biotechnology

Contact: Linda Beth Schilling

(301) 975-2887

email: linda.schilling@nist.gov A225 Administration Building

Health-Related Biotechnology

• A Long-Term Pressure-Sensing System for Use in the Human Body and Harsh Environ- ments—Apex Medical, Inc.* and East Devel- opment Group, Inc.

'Joint venture lead partner
ADVANCED TECHNOLOGY PROGRAM 21

• Development of Multi-Photon Detection Technique and its Application to Environ- mental and Biomedical Diagnostics

BioTraces, Inc.

• Development of Novel DNA Binding Proteins as Antiviral Therapeutics—Sangamo

Biosciences, Inc.

• Low-Temperature Viral Inactivation

Aphios Corp.

• Measurement Technology for Quantitation of the Complete Human Proteome

Large Scale Biology Corp.

Industrial andAgricultural Biotechnology

• Enhanced Manufacturing Technologies

for Bioactive Proteins and Peptides in Transgenic Tobacco—CropTech Development

Corp.* and Dyax Corp.

• Oleaginous Yeast Fermentation as a Pro- duction Method for Squalene and Other Iso- prenoids—Mycogen Corp.

• Standardization of 2-D Protein Analysis

Using Manufacturable Gel Media—Large

Scale Biology Corp.

• Transgenic Cotton Fiber with Polyester

Qualities via Biopolymer Genes—Agracetus/ A Unit of Monsanto Co.

• U.S. Self-Sufficiency in High-Quality Pyrethrin Production—AgriDyne Technologies,

Inc.

• Using Biotechnology to Control Fruit Ripening—Agritope, Inc.

Materials and Manufacturing

Office

Contact: John Gudas

(301) 975-3214

email: john.gudas@nist.gov A225 Administration Building

Materials Processing for Heavy

Manufacturing

Contact:

Clare Allocca

(301) 975-4359

email: clare.allocca@nist.gov A225 Administration Building

Advanced Materials Technologies

• Development of a High-Pressure Oxygen

Generator Using a Solid Electrolyte Oxygen

Separation Technology—Ceramatec, Inc.

• Rapid Solidification Powder Metallurgy

for High-Nitrogen Stainless Steels—Crucible, Compaction Metals Division

Microelectron ics Manufacturing

Infrastructure

• Conducting Polymers: Three- Dimensional Engineering for Advanced

Applications—IBM Corp., T.J. Watson

Research Center

• Novel Synthetic Fused Quartz for Semiconductor Manufacturing—General Electric Corporate R&D

• Solder Jet Technology Development

Microfab Technology, Inc.

• Ultra-Low k Dielectric Materials for High- Performance Interconnects—Texas Instru- ments, Inc.

Net-Shape Manufacturing

• Aqueous Injection Molding for Low-Cost

Fabrication of Silicon Nitride Components

AlliedSignal, Inc., Ceramic Components

• Ceramic Technology for Broad Based Manufacturing—AlliedSignal, Inc.

• Cost-Effective Blade Manufacturing for Combustion Turbine Applications—PCC Airfoils, Inc., Manufacturing Technology Center and Westinghouse Power Generation, A

Division of CBS Corp.*

» Cost-Effective, Near-Net-Shape, Superalloy Forgings for Power Generation Gas Turbines—Wyman-Gordon Co.

• Development of Casting Technology to Produce Large Superalloy Castings for Industrial Applications—PCC Structural, Inc. (formerly Precision Castparts Corp.)

• Low-Cost, Near Net-Shape Aluminium

Casting Processes for Automotive and Truck Components—AlliedSignal, Inc.*; Stahl

Specialty Co.; and Top Die Casting Company, Inc.

• Novel Near-Net-Shape Processing of Engi- neered Ceramics—Garrett Ceramic Components (Division of AlliedSignal Aerospace)

Surface Modification

• Accelerated Commercialization of Diamond-Coated Round Tools and Wear

Parts—Kennametal, Inc., Corporate Technology Center and Norton Diamond Film*

• Ceramic Coating Technology for the Inter- nal Surfaces of Tubular/Cylindrical Components—Praxair Surface Technologies, Inc.

• CVD Diamond-Coated Rotating Tools for Machining Advanced Composite Materials

Boeing Commerical Airplane Group; Crystal- lume, A Division of Advanced Refractory

Technologies, Inc.*; Ford Motor Co., V-Engine Manufacturing Engineering; General Motors Corp., Technical Center; Hughes Aircraft Co.; and Rogers Tool Works,

Inc.

*Joint venture lead partner
ADVANCED TECHNOLOGY PROGRAM

• Diamond-Like Nanocomposite Technology—Advanced Refractory Technologies,

Inc.

• Engineered Surfaces for Rolling and Slid- ing Contacts—Caterpillar, Inc., Advanced

Materials Technology*; General Motors

Corp., Gear Center; and Timken Co.

• Functionally Gradient Materials—Synthesis, Process and Performance—Caterpillar,

Inc.

• Plasma Technology for Low-Cost Dia- mond Production—SGS Tool Co. and West- inghouse Electric Co.*

Joining, Cutting and Grinding

• Fabrication of Advanced Structures Using

Intelligent and Synergistic Materials Process- ing—Caterpillar, Inc., Fabricated Structures R&D*; Lincoln Electric Co.; Tower Automotive (formerly A.O. Smith); and U.S. Steel

Knowledge-Based Manufacturing

• Intelligent Processing of Materials for Thermal Barrier Coatings—General Electric Corporate R&D, Power Generation

Motor Vehicle Manufacturing Technology

Contact: Jack Boudreaux

(301) 975-3560

email: jack.boudreaux@nist.gov A225 Administration Building

Advanced Materials Technologies

• Nanocomposites: New Low-Cost, HighStrength Materials for Automotive Parts

Magna International of America and The

Dow Chemical Co.*

Net-Shape Manufacturing

• Agile Precision Sheet-Metal Stamping

A. J. Rose Manufacturing Co.; Allen Bradley

Co., Inc.; American Iron and Steel Institute;

Atlas Technologies; Autodesk, Inc.; Autodie

International, Inc.; Chrysler Corp.; Classic Design, Inc.; Data Instruments, Inc.; Deneb

Robotics, Inc.; Ford Motor Co.; General Motors Corp., Flint Metal Fabricating Plant; HMS Co.; HMS Products Co.; Helm Instrument; Lamb Technicon; Near Zero Stamping, Inc. (c/o Auto Body Consortium)*;

Ohio State University; Oxford Automotive

(formerly Lobdell-Emery Manufacturing

Co.); Perceptron, Inc.; Sekely Industries; Sig- nature Technologies; Tecnomatix Technologies, Inc.; Tower Automotive; and Verson

• Low Cycle Time Liquid Molding Process

for Automotive Structural Components

Stewart Automotive Research, LLC

• Motor Vehicle Rapid Toolmaker

Sanders Prototype, Inc.

• Springback Predictability in Automotive Manufacturing—Alcoa Aluminum Co. of America; Budd Co., Technical Center; Chrysler Corp.; Environmental Research Institute

of Michigan*; Ford Motor Co., Scientific Research Labs; General Motors Corp., North American Operations Research Analytics; and U.S. Steel

• The Next-Generation Industrial Production Process for High-Density Powder Metal Products—General Motors Corp., Powertrain Division; IAP Research, Inc.*; and

Zenith Sintered Products, Inc.

Coatings, Diamond Deposition, and Multi- layer Materials

• Cubic Boron Nitride Coatings for Cutting and Specialty Tools—Extrude Hone Corp. and Kennametal, Inc., Corporate Technology Center*

Surface Modification

• Plasma-Based Processing of Lightweight

Materials for Motor-Vehicle Components

and Manufacturing Applications—A.O. Smith Corp.; ABB High Power Semiconductors; Diversified Technologies, Inc.; Empire Hard Chrome, Inc.; Environmental Research

Institute of Michigan*; General Motors

Corp., Electrical and Electronics Depart- ment; Harley-Davidson Motor Co.; IONEX;

Kwikset Corp.; Litton Electron Devices; NANO Instruments, Inc.; PVI; and University

of Wisconsin at Madison, Engineering

Research

Joining, Cutting, and Grinding

• Advanced Welding Technology for Structural Automotive Products—Dana Corp., Parish Light Vehicle Structures Division

• Flow-Control Machining—Extrude Hone

Corp.*; Ford Motor Co., Scientific Research

Labs; General Motors Corp., Powertrain Division; University of Nebraska at Lincoln; and

University of Pittsburgh

• Intelligent Resistance Welding—Alcan Aluminum Corp.; Allen Bradley Co., Inc.; American Iron and Steel Institute; Ansys,

Inc.; Battelle Memorial Institute; Chrysler

Corp.; DuPont Central Research; Ford Motor

Co., Manufacturing Development Center; General Motors Corp., NAO, Mid-Lux; Intelli- gent Resistance Welding Consortium (c/o Auto Body Consortium)*; Johnson Controls,

Inc., Automotive Systems Group; Lamb Technicon; Medar, Inc.; Progressive (PICO);

RoMan Manfacturing, Inc.; Robotron;

Sensotec, Inc.; and Tower Automotive

• Sub-Micron Precision Grinding of Advanced Engineering Materials

Cincinnati Milacron; Cummins Engine

Co.*; and Goldcrown Machinery

Machine Tools

• Agile Precision Line Boring—Lamb

Technicon

• Development of the 3-D Printing Process

for Direct Fabrication of Automotive Tooling

for Lost Foam Castings—Extrude Hone

Corp.* and General Motors Powertrain Group

• Flexible Low-Cost Laser Machining for Motor Vehicle Manufacturing—SDL, Inc.* and Utilase Systems, Inc.

• Machine Tool Process Monitoring Diagnostic System—Montronix, Inc.

• Non-Circular Turning Process for Camshaft Machining—Saginaw Machine Sys- tems, Inc.

• Rapid Fabrication of Superabrasive Grinding Tools—Abrasive Technology Aerospace,

Inc.

'Joint venture lead partner
ADVANCED TECHNOLOGY PROGRAM 23

• Real-Time Active Balancing for HighSpeed Machining—Balance Dynamics

Corp.

Imaging and Measurement Technology

• Fast, Volumetric X-ray Scanner for Three- Dimensional Characterization of Critical

Objects—EG&G Reticon; General Electric

Aircraft Engines; General Electric Corporate R&D: General Motors Corp., Technical Center; and Scientific Measurement Systems,

Inc.*

• High Performance Sensor Arrays for Digital X-ray and Visible Light Imaging—TPL,

Inc.; Thermotrex Corp.; and Xerox Corp., Palo Alto Research Center*

• Technology for Gear Performance Prediction Utilizing High-Speed Precision Measure- ment—M&M Precision Systems Corp.

• Wet Paint Thickness Measurement Sys- tem—Autospect, Inc.

Knowledge-Based Manufacturing

• Development of Advanced Technologies and Systems for Controlling Dimensional

Variation in Automobile Body Manufacturing—2mm-Auto Body Consortium*; CDI- Modern Engineering; Chrysler Corp.; Classic Design, Inc.; Detroit Center Tool, Inc.; General Motors Corp., Technical Center; ISI Robotics; Perceptron, Inc.; Pioneer Engineering & Manufacturing; Progressive Tool &

Industries, Inc.; University of Michigan, Mechanical Engineering and Applied Mechanics; and Weber Technologies, LLC

(formerly ASC, Inc.)

• Die Casting Technician's Digital Assistant—AI WARE; Doehler-Jarvis; and Edison

Industrial Systems Center*

• Flexible Robotic Assembly for Powertrain

Applications—Automated Powertrain Assembly Consortium (c/o NCMS)*; Ford Motor

Co.; MicroDexterity Systems; Perceptron,

Inc.; and Progressive Tool & Industries Co.

• Manufacturing Agility Server—Flavors Technology

• Next Generation Agile Fixturing System

Lamb Technicon

Premium Power

Contact: Gerald Ceasar

(301) 975-5069

email: gerald.ceasar@nist.gov A225 Administration Building

• Advanced Magnesium Alloys Production

Process—Manufacturing Sciences Corp. and

Ovonic Battery Co. (ECD)*

• Development of Rapid Thermal Process- ing to Produce Low Cost Solar Cells

Solarex, A Business Unit of Amoco/Enron

Solar

• Ultrathin Silicon Ribbon for HighEfficiency Solar Cells—Evergreen Solar, Inc.

Vapor Compression Refrigeration

Technology

Contact: John Gudas

(301) 975-3214

email: john.gudas@nist.gov A225 Administration Building

• Development of Closed Cycle Air Refrig- eration Technology for Refrigeration Markets—Air Products and Chemicals, Inc.* and Toromont Process Systems, Inc.

• Ejector Expansion Refrigeration Cycle

Calmac Manufacturing Corp.

• High- and Variable-Speed Co-Rotating

Scroll—Copeland Corp.

• Innovative, Small, High-Speed, Centrifugal Compressor and Integrated Heat- Exchanger/Fan Technologies

AlliedSignal, Inc.; Carrier Corp.; DuPont

Fluoroproducts; General Electric Corporate R&D; Lockheed Martin Corp. (formerly Martin-Marietta Corp.); SatCon Technology

Corp.; and United Technologies Corp., Research Center*

• Novel Leak Detection Technology Develop- ment—Adaptive Optics Associates, Inc.; DeMaria Electroptics Systems, Inc.; and

United Technologies Research Center*

• Photocatalytic Indoor Air Purification for

Air Conditioning Systems—E. Heller & Co.

• York Coil Technology Project—York

International Corp.

General Projects Related to Materials and

Manufacturing

Contact: John Gudas

(301) 975-3214

email: john.gudas@nist.gov A225 Administration Building

Machine Tools

• Advanced Compensation Techniques

for Enhancing Machine-Tool Accuracy

Saginaw Machine Systems, Inc.

• Development of an Adaptive Compensation Technique for Enhancing CMM Accuracy—Giddings & Lewis, Inc., Sheffield Measurement Division

• Octahedral Hexapod Machine Develop- ment Program—Ingersoll Milling Machine

Co.

• Strategic Machine Tool Technologies:

Spindles—Aesop, Inc.; Ford Motor Co., Alpha Development Center; General Motors

Corp., NAO Technical Center; Giddings &

Lewis, Inc., Automation Technology; Manufacturing Laboratories, Inc.; National Center

For Manufacturing Sciences, Inc.*; Olofsson Machine Tools, Inc.; Setco Sales Co.; and

Torrington Co.

Imaging and Measurement Technology

• A Non-intrusive Method for Intelligent Process Control of the Densification of Powder Preforms During Electroconsolidation

Superior Graphite Co., Inc.

• Low-Cost Amorphous Silicon Manufacturing Technology—EG&G Reticon and General Electric Corporate R&D*

• Robust, Fast 3-D Image Processing and

Feature Extraction Tools for Industrial Auto- mation Applications—Perceptron, Inc.

*Joint venture lead partner
24 ADVANCED TECHNOLOGY PROGRAM

Knowledge-Based Manufacturing

• Collaborative Decision Support for Industrial Process Control—Amoco Corp., World- wide Engineering and Construction; Applied

Training Resources; BP Oil; Chevron; Exxon

Research and Engineering; Gensym Corp.; Honeywell, Inc., Technology Center*; Mobil;

Shell Chemical Co.; and Texaco, Inc.

• NCMS Rapid Response Manufacturing

Cimplex Corp.; Ford Motor Co., Manufacturing Development Center; General Motors

Corp., Technical Center; I CAD, Inc. (Concentra); MacNeal Schwendler Corp.; National

Center for Manufacturing Sciences, Inc.*;

Spatial Technology Inc.; Teknowledge Corp.; Texas Instruments, Inc.; and United Technologies Corp., Hamilton Standard Division, Research Div.

Ceramics

• Novel Cost-Effective Process to Fabricate Surface Feature Micro-Optics in Pure Silica—Geltech, Inc.

• Synthesis and Processing of Nanocrystalline Ceramics on a Commercial

Scale—Nanophase Technologies Corp.

Other Manufacturing and Materials

Projects

• A Software Technology for Optimizing

On-time Performance in the Transportation

Industry—Union Switch & Signal, Inc.

• Advanced Gear Measurement Technologies to Achieve Submicron-Level Accuracies—M&M Precision Systems Corp.

• Autonomous Navigation in QuasiStructured Environments—HelpMate Robotics (formerly Transitions Research Corp.)

• Development of Cost-Effective Routes to Compatibilize Polymers in a Commingled

Waste Stream—Michigan Molecular

Institute

• Development of TERFENOL-D High- Powered Ultrasonic Transducer Technology

for Sonochemistry—ETREMA Products, Inc.

• Electrochromic Materials—3M Co.,

Industrial and Consumer Sector Research

Laboratory* and SAGE Electrochromics

• Neural Network Control and Sensors for Complex Materials—3M Co., Engineering

Systems and Technology; Alliant Techsys- tems (formerly Hercules Aerospace); Honeywell, Inc., Technology Center*; and Sheldahl

• Non-Contact Optical Metrology of Complex Surface Forms for Precision Industrial Manufacturing—Tropel Corp.

• Novel X-ray Source for CT Scanners

Teledyne Electronic Technologies, Vacuum

Technology Business Unit

• PREAMP: Pre-Competitive Advanced

Manufacturing of Electrical Products

Boeing Co., Defense and Space Group,

Hughes Aircraft Co.; Martin Marietta Corp.,

Electronics Information and Missiles Group,

a subsidiary of Lockheed Martin; Rensselear

Polytechnic Institute; Rockwell International Corp., Collins Avionics and Communication Division; and South Carolina Research Authority*

• Rapid Agile Metrology for Manufacturing—Brown & Sharpe Manufacturing Co.;

Caterpillar, Inc., Technical Services Division; Central State University; Cleveland Advanced Manufacturing Program; Eaton

Corp., Manufacturing Technologies Center; General Electric Aircraft Engines; General

Electric Corporate R&D; Industrial Technical Institute; Intelligent Automation Sys- tems; NASA Lewis Research Center; Ohio

Aerospace Institute (Consortium for Noncontact Gauging)*; and University of Cincinnati, Department of Electrical and Computer

Engineering

• Thermal Insulation Materials—Morphology Control and Processes for the Next Generation of Performance—Armstrong World

Industries, Inc., Innovation Center

• Thick Ductile Metallic Glass for Electric Power Applications—AlliedSignal, Inc.

*Joint venture lead partner
MANUFACTURING

EXTENSION PARTNERSHIP

Overview

The NIST Manufacturing Extension Partnership (MEP) is a nationwide network of

locally managed extension centers offering

technical assistance and the latest business

practices to help the nation's smaller manufacturers improve their competitiveness. At

the heart of MEP is a network of more than 400 manufacturing extension centers and

field offices located throughout the country.

Started in 1989, today's network delivers

services to manufacturers in all 50 states and Puerto Rico.

Smaller Manufacturers:

Critical to the U.S.

Economy

Numbering more than 380,000, small and

mid-sized manufacturers make vital contri- butions to the economy. About 98 percent of

the nation's manufacturers are small to medium-sized, defined as having fewer than

500 employees. They supply more than 50

percent of the value added in U.S. manufacturing and employ nearly 12 million people. That accounts for 75 percent of all U.S. manufacturing workers with high-skilled,

high-wage jobs, paying an average 89 per- cent more than the average retail salary.

As large manufacturers increase their dependence on suppliers for parts and services, the performance and capabilities of smaller manufacturers become even more

critical to the competitiveness of the entire manufacturing sector and to the health of the U.S. economy. Yet, according to a

National Research Council report, "Many of

these small firms ... are operating far below

their potential. Their use of modern manufacturing equipment, methodologies, and

management practices is inadequate to ensure that American manufacturing will be

globally competitive." Limited budgets, lack

of in-house expertise, and lack of access to the newest technologies are but a few of the

significant barriers faced by smaller manufacturers—barriers that MEP helps firms overcome.

MEP Extension Centers

MEP centers are local resources serving their

local markets. Linked together through

NIST's MEP, they are part of a national net- work of manufacturing and business

experts. They exist as the result of a partnership among the federal government, state/

local governments, and industry to help

local manufacturers. They are created through a competitive, merit-based process where funding is contingent upon successful annual reviews of each center. MEP centers

are supported by contributions from public and private organizations that match federal funding.

While part of a national network, MEP centers are independent, non-profit organizations. They offer products and services that meet the specific needs of the region's local manufacturers. Each center works directly with area firms to provide expertise and services tailored to their most critical needs, which range from process improvements and worker training to business practices and applications of information technology.

Solutions are offered through a combination

of direct assistance from center staff and

work with outside consultants. MEP centers

are staffed by knowledgeable manufacturing

engineers and business specialists who typically have years of practical experience

gained from working on the manufacturing

floor, managing plant operations,

or both. MEP center staff also know the

local business community and the available

local resources and can access additional

resources available through the MEP net- work. As a result, centers help small firms to overcome barriers in locating and obtaining

private-sector resources.

MEP centers work with companies that are willing to invest in themselves. That means

companies that are willing to invest time, money, and/or human resources to improve

their businesses. Typical MEP clients include manufacturers who:

• have been unable to locate the proper

resources or technologies they need;

• want expert, impartial advice in helping

them evaluate alternative solutions;

• need help solving a specific problem, such as determining the cause of product

defects, modifying plant layout to improve work flow, or establishing employee training;

• want assistance in reversing negative busi- ness situations—such as sales decreases,

loss of market share, or cost increases;

• want to implement new technologies or

processes that will help establish them as market leaders; or

• seek to improve their ongoing business

operations for peak performance.

How Centers Help

ASSESSMENTS

Many firms begin their relationship with an MEP center through an assessment of the company's current operations and opportunities for improvement. As part of that assess- ment, field engineers may review the manufacturing process, the plant layout, the inventory and materials flow, and the policies and procedures. Field engineers, also known as manufacturing specialists, then

prepare an evaluation of the firm and its

operations. These findings are reviewed with management and other key personnel at the manufacturing company.
MANUFACTURING EXTENSION PARTNERSHIP

MEP Success Stories

MEP's locally managed centers have worked with thousands of smaller manufacturers, providing the technical and

business assistance the companies needed

to improve their performance and become

more competitive. The following examples show how companies have benefited by working with an MEP center.

• The Futon Shop, a client of the Bay

area's MEP affiliate in California—The

Corporation for Manufacturing Excel- lence or MANEX—was experiencing difficulties in meeting production demands in an efficient and cost-effective manner. MANEX provided the solution by designing

a customized training program that used

the manufacturer's own employees to

resolve issues. In addition to identifying waste, production line personnel designed

a new inventory and assembly system that met current production requirements and

allowed the manufacturer to increase output systematically. These changes

increased overall production by 30 percent, eliminated over $100,000 in waste

annually, saved an immediate $20,000

per month in payroll costs, and reinvented

the manufacturing culture.

• Southern Automation Inc., located in Shreveport, La., designs and builds auto- mated material-handling equipment that

is used by Fortune 500 companies for manufacturing operations. With engineering help from the MEP affiliate in Louisiana—the Louisiana Manufacturing

Technical Extension Center or LAMTEC —

the company has been able to break into the robotics and custom automation field

in a big way. Southern Automation

needed engineering design help to pro- duce more custom manufacturing equip- ment. LAMTEC industrial design experts helped the company open up new markets

and increase business volume by roughly 20 percent. "When I heard of LAMTEC, I couldn't believe that such a program

existed to help businesses," said company

president Dennis Rimmer. "I am now a

believer. It has been great for us."

• In 1995, the Plastics Group, a small company specializing in custom injection

molding, engineering, testing, and tool- ing for plastic products, grew concerned

about its lack of profitability. Manage- ment thought the firm had a production

problem and considered expensive, company-wide production and accounting

changes. Specialists with the MEP affiliate

in Georgia—the Georgia Manufacturing

Extension Alliance—determined costing

and marketing issues were the culprits. Changes in quality procedures yielded some $30,000 in material savings, and

revamped marketing efforts generated more than $500,000 in new sales. Its new

base of business also enabled the company to hire 20 new employees. For the

first time in two years, the firm was

profitable.

• Lorrie Browning never dreamed she would be running a snack food manufacturing plant when she started making beef

jerky in her kitchen in 1995. Testing a new food dehydrator, she tried out her own recipe on friends and relatives, who

kept asking for more. Knowing she was

onto something, Browning stepped up her

process, contacted the U.S. Department of Agriculture (USDA), and launched her

business. Next, she looked for help in financing a building, buying equipment,

and improving process management.

That's when she contacted the MEP affiliate in northeastern Pennsylvania, called the Northeastern Pennsylvania Industrial Resource Center (NEPIRC). Engineers

with NEPIRC helped Browning set up and

modify her processing systems, particularly the venting for dehydrators. The net

effect was an increase in beef dehydrating

throughputs and a USDA-approved manufacturing process. Experts also helped

Browning secure the necessary funds for the manufacturing facility and process equipment. The result was an increase in

staff to five employees and a 1,000 percent

increase in production, from 25 to 250 pounds per day.

• Kansas-based Robbie Manufacturing was able to trim its costs and boost its profitability with help from the MEP affiliate

in Kansas, known locally as the Mid- America Manufacturing Technology Center. By videotaping employees using new

techniques for setup reduction and quick

changeover on one product line, employee team members were able to apply the same techniques and establish new stand- ardized manufacturing processes, saving

the company an estimated $150,000.

• Efficiency increased by 295 percent as a

result of a process redesign for Boozer Lumber Company located in Columbia,

S.C. The South Carolina Manufacturing

Extension Partnership (SCMEP) helped Boozer Lumber Company realize an

impact of over $11.2 million through

inventory reduction, capital avoidance,

savings in materials and labor, increased

sales, and jobs created. After the South

Carolina MEP evaluated existing industry

tools and technologies, a prototype truss

fabrication system was built. Benchmark

studies then were used to evaluate the setup and build time of 16 specific trusses. 'As a direct result of SCMEP's assistance, we have reinvented our company into a world-class operation," said Bob Jones,

chief executive officer of Boozer Lumber

. Company.
MANUFACTURING EXTENSION PARTNERSHIP

As a result of the assessment, MEP manufacturing specialists may recommend a few simple, quick solutions or a detailed plan of

action. Both types of recommendations are designed to provide quantifiable, bottomline impact on performance—productivity,

quality*, profits, or sales.

For some firms, these assessments are enough to get started. The manufacturer may have the resources to implement the

plan, or may incrementally pursue new

initiatives or changes. For those manufacturers requiring assistance in implementing

center-suggested actions, the MEP center can provide the solutions and the support.

TECHNICAL AND BUSINESS SOLUTIONS

The degree and type of assistance provided

to each MEP customer firm is based on the

particular need of that manufacturer. For a

firm dealing with employee relations and

human resource issues, for example, support may come through a management

training program, a series of staff workshops, or revamping relevant policies and

procedures—all services managed by the

center staff either independently or through

other experts. If the field engineers identify

inefficiencies in the physical layout of the

plant, they may provide a number of options

for reconfiguration and may guide the process for testing these alternatives. Other services may focus on quality improvement, new

product development, new equipment needs, marketing and sales support, or capital investments.

ACCESS TO RESOURCES

Sometimes, the technical guidance needed

by a manufacturer is best found beyond the MEP center. That is when the value of MEP

is most apparent. Through both its local and

national network of partners, MEP staff can

identify experts and resources from the region—or across the country—that can

help improve a company's performance. In

fact, the MEP network provides small manufacturers with access to over 2,000 partnerships with federal agencies, national

associations, and other organizations. Projects with the U.S. Department of Labor,

U.S. Department of Energy, U.S. Environ- mental Protection Agency, U.S. Department

of Defense, federal labs, and manufacturing

associations are examples of how MEP

leverages public and private resources to make a comprehensive range of technical

services and assistance available to small manufacturers.

SEMINARS AND TRAINING

Even' day, MEP centers deal with manufacturers who share common problems and

seek similar assistance. Often, manufacturers may not be aware of available resources. To help manufacturers improve their knowledge and capabilities, centers provide a variety of seminars and training programs. These seminars may address issues unique

to a specific community or information sought by many firms, such as preparing for ISO 9000 certification, implementing waste

reduction programs, finding and hiring

employees, or profiling the newest manufacturing technologies.

In addition, MEP centers help provide manufacturing firms with exposure to other manufacturers in the area—and the opportunity to share resources and information. Regular events, including tours of local manufacturing facilities, discussions, and

demonstrations of the latest industry innovations, give company owners and managers

the opportunity to see state-of-the-art processes and discuss common issues with their

peers.

MEP Results

Evaluation is a key element of all MEP pro- grams and activities. Results are used to

assess the effectiveness of services and their impact on the performance of client firms, and to help guide planning at both the center and network levels. By measuring short- and long-term impacts, MEP also can assess economic returns on the federal investment

in manufacturing extension services.

The U.S. Census Bureau surveyed 2,350

firms served by MEP centers in 1996. These companies reported an increase in sales

of nearly $110 million and showed savings

of $16 million in inventory and over $13 million in labor and material. They also invested more than $85 million in modernization. These companies directly attribute

these benefits to the services provided by the NIST manufacturing extension centers.

Other independent studies also have yielded

solid evidence of performance and economic

benefits. An analysis by the U.S. General Accounting Office found that a substantial majority of firms using extension services, including those provided by the MEP, credited this assistance with helping them to improve productivity, product quality, cus- tomer satisfaction, profits, and other critical

facets of their operations.

Additional Information

For additional information, contact:

Manufacturing Extension Partnership

(301) 975-5020

email: MEPinfo@mep.nist.gov

fax: (301) 963-6556 C121 Building 301 www.mep.nist.gov

or see the list of centers below or phone

(800) MEP-4MFG for direct access to your

local Manufacturing Extension Partnership

affiliate.
MANUFACTURING EXTENSION PARTNERSHIP

MEP Center Locations

Most MEP centers are affiliated with state,

local, and educational organizations. In the following listing, each center serves the

entire state unless otherwise noted.

ALABAMA

Alabama Technology Network

1500 Resource Drive Birmingham, Ala. 35242

(205) 943-4770

ALASKA

Alaska Manufacturing Extension Partnership

c/o Industry Network Corp. 155 University Blvd. S.E. Albuquerque, N.M. 87106

(505) 843-4250 or (800) 716-6462

ARIZONA

Industry Network Corp. 1155 University Blvd. S.E. Albuquerque, N.M. 87106

(505) 843-4250 or (800) 716-6462

ARKANSAS

Arkansas Manufacturing Extension Network

100 Main St., Suite 450

Little Rock, Ark. 72201

(501) 324-9006

CALIFORNIA

California Manufacturing Technology

Center 13430 Hawthorne Blvd. Hawthorne, Calif. 90250

(310) 355-3060

Serves the five-county Los Angeles basin, Fresno, and Sacramento through seven

regional offices.

San Diego Manufacturing Extension

Center, Inc. World Trade Center 1250 Sixth Ave., 5th Floor San Diego, Calif. 92101-4301

(619) 515-9820, ext. 1201

Serves firms in San Diego County.

The Corporation for Manufacturing

Excellence 48001 Fremont Blvd. Fremont, Calif. 94538

(510) 249-1480

Serves the nine counties of the Bay area.

COLORADO

Mid-America Manufacturing Technology

Center 10561 Barkley, Suite 602

Overland Park, Kan. 66212

(913) 649-4333 A regional organization that also operates in Kansas, Missouri, and Wyoming.

CONNECTICUT

Connecticut State Technology Extension Program

185 Main St., Suite 408 New Britain, Conn. 06051

(860) 832-4600

DELAWARE

Delaware Manufacturing Alliance Delaware Technology Park One Innovation Way, Suite 301 Newark, Del. 19711

(302) 452-2520

FLORIDA

Florida Manufacturing Technology

Center, Inc. 390 N.Orange Ave., Suite 1300

Orlando, Fla. 32801

(407) 316-4633

GEORGIA

Georgia Manufacturing Extension Alliance Georgia Institute of Technology

223 O'Keefe Building

Atlanta, Ga. 30332-0640

(404) 894-8989

HAWAII

Hawaii Manufacturing Extension Center

c/o Industry Network Corp. 1155 University Blvd. S.E. Albuquerque, N.M. 87106

(505) 843-4250 or (800) 716-6462

IDAHO

Idaho TechHelpTM

Boise State University 1910 University Drive

Boise, Idaho 83725

(208) 385-3689

ILLINOIS Chicago Manufacturing Center 3333 West Arthington

Chicago, 111. 60624

(773) 265-2020

Serves the six-county Chicago metropolitan

area: Cook, DuPage, Kane, Lake, McHenry, and Will counties.

Illinois Manufacturing Extension Center

Bradley University 404 Jobst Hall

Peoria, 111. 61625

(309) 677-4632

Serves manufacturers through 16 locations throughout northern, southern, and central

Illinois.

INDIANA

Indiana Business Modernization and

Technology Corp. One North Capitol Ave., Suite 925

Indianapolis, Ind. 46204-2242

(317) 635-3058 or (800) 877-5182

IOWA

Iowa Manufacturing Technology Center Des Moines Area Community College ATC Bldg. 3E

2006 South Ankeny Blvd. Ankeny, Iowa 50021

(515) 965-7125

KANSAS

Mid-America Manufacturing Technology

Center 10561 Barkley, Suite 602

Overland Park, Kan. 66212

(913) 649-4333 A regional organization that also operates in Missouri, Colorado, and Wyoming.
MANUFACTURING EXTENSION PARTNERSHIP 29

KENTUCKY

Kentucky Technology Service 167 West Main St., Suite 500

Lexington, Ky. 40507

(606) 252-7801

LOUISIANA

Louisiana Manufacturing Technical

Extension Center

P.O. Box 44172

241 East Lewis St.

Lafayette, La. 70504-4172

(318) 482-6767

MAINE

Maine Manufacturing Extension Partnership 87 Winthrop St. Augusta, Maine 04330

(207) 621-6350

MARYLAND

Maryland Technology Extension Service University of Maryland Engineering

Research Center Potomac Building 092, Room 2104

College Park, Md. 20742-3415

(301) 405-3883

MASSACHUSETTS

Massachusetts Manufacturing Partnership

Corporation for Business, Work, and

Learning

The Schrafft Center 529 Main St. Boston, Mass. 02129

(617) 727-8158 or (800) 667-6347

MICHIGAN

Michigan Manufacturing Technology Center

P.O. Box 1485

2901 Hubbard Road Ann Arbor, Mich. 48106

(800) 292-4484

MINNESOTA

Minnesota Technology, Inc. Ill Third Ave. South

Minneapolis, Minn. 55401

(612) 338-7722

MISSISSIPPI

Mississippi Technology Extension

Partnership

Building 1103, Suite 146K

Stennis Space Center, Miss. 39529

(228) 688-3535 or (800) 746-4699

Mississippi Polymer Institute and Pilot Manufacturing Extension Center

P.O. Box 10003

Hattiesburg, Miss. 39406-5157

(601) 266-4607

Serves polymer and polymer-related firms throughout Mississippi.

MISSOURI

Mid-America Manufacturing Technology

Center (MAMTC)

10561 Barkley, Suite 602

Overland Park, Kan. 66212

(913) 649-4333

Serves the seven-county St. Louis area. A regional organization that also operates in Kansas, Colorado, and Wyoming.

MAMTC Missouri Rolla Regional Office 800 W. 14th St., Suite 111

Rolla, Mo. 65401

(573) 364-8570 or (800) 95-MAMTC

(956-2682)

Serves rural Missouri through four regional

offices.

MONTANA

Montana Manufacturing Extension Center Montana State University 313 Roberts Hall Bozeman, Mont. 59717

(406) 994-3812

NEBRASKA

Nebraska Industrial Competitiveness Service 301 Centennial Mall South, 4th Floor

Lincoln, Neb. 68509-4666

(402) 471-6513

NEVADA

Nevada Manufacturing Extension

Partnership

c/o Industry Network Corp. 1155 University Blvd. S.E. Albuquerque, N.M. 87106

(505) 843-4250 or (800) 716-6462 NEW HAMPSHIRE

Manufacturing Extension Partnership of New Hampshire, Inc. 505 Amherst St. Nashua, N.H. 03061-2052

(603) 594-1188 NEW JERSEY

New Jersey Manufacturing Extension Program

New Jersey Institute of Technology

University Heights G ITC Suite 3200

Newark, N.J. 07102-1982

(973) 642-7099 NEW MEXICO

Industry Network Corporation 1155 University Blvd. S.E. Albuquerque, N.M. 87106

(505) 843-4250 or (800) 716-6462 NEW YORK

New York Manufacturing Extension

Partnership

New York Science and Technology

Foundation

99 Washington Ave, Suite 1730

Albany, N.Y. 12210

(518) 486-7384

Serves firms statewide through 10 regional

offices listed below.

• Alliance for Manufacturing and

Technology

6l Court St., 6th Floor Binghamton, N.Y. 13901

(607) 774-0022

Serving a nine-county area within New

York's southern tier.
MANUFACTURING EXTENSION PARTNERSHIP

Center for Economic Growth One Key Corp. Plaza, Suite 600

Albany, N.Y. 12207

(518) 465-8975

Serves the 1 1-county Capital District in the Albany area.

Central New York Technology

Development Organization

1201 East Fayette St. Syracuse, N.Y. 13201

(315) 425-5144

Serves the five counties in central New York in the Syracuse area.

CI-TEC Box 8561, Peyton Hall Potsdam, N.Y. 13699-8561

(315) 268-3778

Serves six counties in the North Country area.

High Technology of Rochester

Five United Way

Rochester, N.Y. 14604

(716) 327-7930

Serves the nine-county Finger Lakes

region, in and around Rochester.

Hudson Valley Technology Development

Center 300 Westage Business Center, Suite 130

Fishkill, N.Y. 12524

(914) 896-6934

Serves the seven-county mid-Hudson region.

Industrial Technology Assistance Corp. 253 Broadway, Room 302 New York, N.Y. 10007

(212) 240-6920

Serves the five boroughs of New York City.

Long Island Forum for Technology

P.O. Box 170 Farmingdale, N.Y. 11735

(516) 755-3321

Serves Nassau and Suffolk counties.

• Mohawk Valley Applied Technology

Commission

207 Genessee St., Room 1604

Utica, N.Y. 13501

(315) 793-8050

Serves Oneida, Herkimer, Hamilton,

Fulton, Montgomery, and Schohari

counties.

• Western New York Technology

Development Center 1576 Sweet Home Road

Amherst, N.Y. 14228

(716) 636-3626

Serves New York's five western-most

counties.

NORTH CAROLINA

North Carolina Manufacturing Extension

Partnership IES Technical Services 900 Capability Drive Raleigh, N.C. 27695-7902

(919) 515-5408

NORTH DAKOTA

North Dakota Manufacturing Technology

Partnership

Institute for Business and Industry

Development

NDSU-Hastings Hall

P.O. Box 5256

Fargo, N.D. 58105-5256

(701) 231-1001

OHIO

Great Lakes Manufacturing Technology

Center (GLMTC)

Prospect Park Building 4600 Prospect Ave. Cleveland, Ohio 44103-4314

(216) 432-5300

Serves northeastern Ohio.

Lake Erie Manufacturing Extension

Partnership 1700 N. Westwood Ave. Toledo, Ohio 43607

(419) 534-3705

Serves 26 counties of northwestern Ohio.

Miami Valley Manufacturing Extension

Center 3155 Research Blvd., Suite 205

Kettering, Ohio 45420

(937) 258-6190

Serves 23 counties of southwestern Ohio.

Plastics Technology Deployment Center GLMTC Manufacturing Outreach Program

Prospect Park Building 4600 Prospect Ave. Cleveland, Ohio 44103

(216) 432-5340

Serves 10 counties in northeastern Ohio

surrounding Cleveland.

OKLAHOMA

Oklahoma Alliance for Manufacturing

Excellence 525 South Main St., Suite 210

Tulsa, Okla. 74103

(918) 592-0722

OREGON

Oregon Manufacturing Extension

Partnership 29353 Town Center Loop East

Wilsonville, Ore. 97070

(503) 657-6958

PENNSYLVANIA

North/East Pennsylvania Manufacturing

Extension Partnership:

• Manufacturers Resource Center

125 Goodman Drive Bethlehem, Pa. 18015

(610) 758-5599 or (800) 343-6732

• Northeastern Pennsylvania Industrial Resource Center

75 Young St. Wilkes Barre, Pa. 18706-1471

(717) 819-8966 or (800) 343-6732
MANUFACTURING EXTENSION PARTNERSHIP

Southeastern Pennsylvania Manufacturing

Extension Partnership:

• Delaware Valley Industrial Resource

Center 2905 South Hampton Road

Philadelphia, Pa. 19154-1286

(215) 464-8550

Serves five counties surrounding

Philadelphia and greater southeastern Pennsylvania.

• Manufacturers' Technology Center 227 W. Market St. P.O. Box 5046

York, Pa. 17405

(717) 843-5054 or (888) 843-5054

Serves nine counties in south-central Pennsylvania.

• Industrial Modernization Center Farm Complex

R.R. #5, Box 220-62A

Montoursville, Pa. 17754

(717) 368-8361 or (800) 326-9467

Serves 12 counties in central Pennsylvania.

Western Pennsylvania Manufacturing

Extension Partnership:

• Southwestern Pennsylvania Industrial Resource Center/Northwest Pennsylvania Industrial Resource Center 2000 Technology Drive

Pittsburgh, Pa. 15219

(412) 687-0200

Serves firms throughout southwestern

Pennsylvania.

• Northwestern Pennsylvania Industrial Resource Center Uniflow Center 1525 East Lake Road

Erie, Pa. 16511-1031

(814) 456-6299

Serves firms throughout northwestern

Pennsylvania.

Plastics Technology Deployment Center Penn State-Erie Behrend College Station Road

Erie, Pa., 16563-0101

(814) 898-6132

Serves 14 counties in northwestern Pennsylvania surrounding Erie.

PUERTO RICO

Puerto Rico Manufacturing Extension, Inc. Mercantil Plaza Building

Suite 819, 2 Ponce de Leon Ave. Hato Rey, P.R. 00918

(787) 756-0505

RHODE ISLAND

Rhode Island Manufacturing Extension

Services 229 Waterman St. Providence, R.I. 02906

(401) 621-5710

SOUTH CAROLINA

South Carolina Manufacturing Extension

Partnership 1136 Washington Street, Suite 300 Columbia, S.C. 29202

(803) 252-6976

SOUTH DAKOTA

South Dakota Manufacturing Extension

Partnership Center South Dakota State University

Harding Hall

P. O. Box 2220

Brookings, S.D. 57007-0199

(605) 688-4184

TENNESSEE

Tennessee Manufacturing Extension

Partnership

University of Tennessee Center for Industrial

Services 226 Capitol Blvd., Suite 606

Nashville, Tenn. 37219-1804

(615) 532-8657

TEXAS

Texas Manufacturing Assistance Center 1700 Congress Ave., Suite 200

Austin, Texas 78701

(512) 936-0235 or (800) 488-TMAC (8622)

UTAH

Utah Manufacturing Extension Partnership Utah Valley State College 800 S. 1200 W. Orem, Utah 84058

(801) 764-7221

VERMONT

Vermont Manufacturing Extension Center Box 500 Randolph Center, Vt. 05061

(802) 728-1421

VIRGINIA

Virginia's A.L. Philpott Manufacturing

Extension Partnership 645 Patriot Ave. P.O.Box 53H

Martinsville, Va. 24112

(540) 666-8890

WASHINGTON

Washington Manufacturing Services 2333 Seaway Blvd.

Everett, Wash. 98203

(425) 267-0173

WEST VIRGINIA

West Virginia Manufacturing Extension

Partnership 317 Mineral Resources Bldg.

P.O. Box 6070 Morgantown, W. Va. 26506

(304) 293-3800

WISCONSIN

Wisconsin Manufacturing Extension

Partnership 432 N. Lake St. RoomB121-B

Madison, Wis. 53706-1498

(608) 262-2224

Serves manufacturers in the northeastern, southeastern, and southwestern regions of the state.
32 MANUFACTURING EXTENSION PARTNERSHIP

Northwest Wisconsin Manufacturing

Outreach Center

University of Wisconsin-Stout 278 Jarvis Hall Menomonie, Wis. 54751-1876

(715) 232-2397

Serving 32 counties in northwestern

Wisconsin.

WYOMING

Mid-America Manufacturing Technology

Center 10561 Barkley, Suite 602

Overland Park, Kan. 66212

(913) 649-4333 A regional organization that also operates in

Missouri, Colorado, and Kansas.

NATIONAL

National Center for Printing, Publishing and Imaging

Rochester Institute of Technology

111 Lomb Memorial Drive

Rochester, N.Y. 14623-5608

(716) 475-2950

Printing and publishing industry resource

serving manufacturers nationwide through

their local MEP affiliate.
BALDRIGE NATIONAL

QUALITY PROGRAM

First presented in 1988, the Malcolm

Baldrige National Quality Award has become

the nation's premier award for business per- formance excellence and quality7 achieve- ment. The Baldrige Award program was

established by Congress in 1987 not only to recognize individual U.S. companies for

their achievement but also to promote quality awareness and to provide information on

successful performance and competitiveness

strategies. The award is not for specific products or services. Two awards may be given

annually to companies in each of three categories: manufacturing, sen-ice, and small

business. In conjunction with the private

sector, NTST developed and manages the award program.

Criteria for Performance

Excellence

The Baldrige National Quality Program

focuses on performance excellence as an

integral part of today's business management practices. The award's criteria for per- formance excellence, used by thousands of organizations as a general performance and

business excellence model, are designed to

help companies deliver ever-improving

value to customers and improve overall company performance and capabilities. More

than 1.5 million copies of the criteria have

been distributed since 1988. The criteria's seven categories focus on requirements that

all businesses—especially those facing

tough competitive challenges—should

understand. The criteria are:

• Leadership. How do the company's senior

leaders set directions and build and sustain a leadership system conducive to high

performance, individual development, initiative, organizational learning, and innovation? Does the company integrate its values and expectations regarding public responsibilities and citizenship into performance

management practices?

• Strategic planning. How are strategic

directions set? Are critical strategies and

action plans developed to support the

directions? Are appropriate resources committed to achieve the strategies?

• Customer and market focus. How does the company determine requirements, expectations, and preferences of customers and markets? How are relationships built with

customers, and how is customer satisfaction determined?

• Information and analysis. Does the company effectively select, manage, and use information and data to support key company processes and action plans and to improve its overall performance and

competitive position?

• Human resource focus. Does the company

enable its employees to develop and use

their full potential? How does the company

build and maintain a work environment

and climate that is conducive to perform- ance excellence, full participation, and personal and organizational growth?

• Process management. How are products

and services designed, introduced, produced,

delivered, managed, and improved?

• Business results. How has the company

performed in key business areas: customer

satisfaction, financial and marketplace per- formance, human resource results, supplier and partner performance, and operational

performance? Has the company shown

improvements, and what is its performance

compared to those of competitors and

benchmarks?

Using the criteria as an assessment tool provides firms with a clear view of where they stand and of how far they must go to achieve world-class levels of performance.

Rigorous Evaluation

Applications for the award undergo a rigor- ous evaluation by an independent review

board comprising more than 300 business and quality experts from many industries (along with a smaller contingent from universities and governments at all levels). These experts volunteer many hours review- ing applications for the award, conducting

site visits at firms that receive high scores

after an initial screening, and providing each applicant with an extensive feedback

report citing strengths and opportunities to improve.

Interactions

The Baldrige National Quality Program has proven to be a remarkably successful govern- ment and industry team effort, starting in 1987 with industry's assistance in raising more than $10 million to help launch the program. Since that time, NIST has worked

closely with a wide variety of groups to extend the benefits of performance excellence and to stimulate activities nationwide. These organizations run the gamut from

trade, professional, and business groups such as the National Association of Manufacturers and the U.S. Chamber of Commerce,

to state and local government organizations such as the National Governors' Association,

to broad-based interest groups like the National Education Association.

The cooperative nature of this joint government/private-sector team is perhaps

best captured by the award's board of examiners. In addition to many hours spent during the award evaluation process, board members have given thousands of presentations on performance excellence and the Baldrige national quality program.

The award recipients, too, have taken seriously the charge to be quality advocates. One of the main purposes of the award is to

pass on information about the Baldrige Award recipients' quality and business processes and results that other companies can

tailor to their own needs. Representatives from the award recipients willingly have
34 BALDRIGE NATIONAL QUALITY PROGRAM

Qualify Award Recipients

Companies that have received the Malcolm

Baldrige National Quality Award:

1997—3M Dental Products Division, St. Paul, Minn, (manufacturing); Solectron

Corp., Milpitas, Calif, (manufacturing);

Merrill Lynch Credit Corp., Jacksonville,

Fla. (service) ; Xerox Business Services,

Rochester, N.Y. (service) 1996—ADAC Laboratories, Milpitas, Calif, (manufacturing): DANA Commercial

1992—AT&T Network Systems Group/

Transmission Systems Business Unit, Morristown, N.J. (manufacturing); Texas

Instruments Inc. Defense Systems &

Electronics Group, Dallas, Texas (manufacturing); AT&T Universal Card Services,

Jacksonville, Fla. (service); The Ritz- Carlton Hotel Co., Atlanta, Ga. (service); and Granite Rock Co., Watsonville, Calif, (small business)

1991—Solectron Corp., Milpitas, Calif, (manufacturing); Zvtec Corp., Eden

shared their companies' performance

excellence strategies and methods with thousands of other firms. Their efforts to educate and inform other companies and or- ganizations on the benefits of using the Baldrige framework and criteria have far ex- ceeded expectations.

Award as Quality Model

Private-sector reviews and surveys are showing that the award is having a profound

effect on shaping how people and organizations operate and work. For example, a

report on the Baldrige Award program by

the private-sector Council on Competitiveness states, "More than any other program,

the Baldrige Quality Award is responsible for making quality a national priority and dis- seminating best practices across the United

States."

The program has helped to stimulate an amazing movement to improve perform- ance in many U.S. organizations, including

companies; academic institutions; and federal, state, and local government agencies.

Nationwide, interest in the Baldrige model

is growing steadily. In 1991, fewer than 10

state and local quality awards existed. Now, more than 50 state and local award pro- grams have been established that are modeled after the Baldrige Award.

For many companies, these award programs

are "proving grounds," helping them to better understand quality and performance

excellence before they consider an application for the national Baldrige Award. In 199T state programs received 110 applications; in 1997 that number climbed to over

970.

Internationally, more than 25 quality awards have been established, most within

the past several years. Many of them are based on the Baldrige Award. Japan, home

of the Deming Prize, recently launched an award that resembles the U.S. Baldrige Award.

Interest also is increasing in organizations

other than for-profit businesses. Working

Credit Corp., Toledo, Ohio (service); Custom Research Inc., Minneapolis, Minn,

(small business); Trident Precision Manufacturing Inc., Webster, N.Y. (small

business)

1995—Armstrong World Industries' Build- ing Products Operation, Lancaster, Pa. (manufacturing) and Corning Telecommunications Products Division, Corning,

N.Y. (manufacturing)

1994—AT&T Consumer Communications

Services, Basking Ridge, N.J. (service); GTE Directories Corp, Dallas/Ft. Worth, Texas (service); and Wainwright Industries

Inc., St. Peters, Mo. (small business)

1993—Eastman Chemical Co., Kingsport, Tenn. (manufacturing) and Ames Rubber

Corp., Hamburg, N.J. (small business)

with experts from healthcare and education

organizations, NIST tailored the Baldrige Award criteria and framework for these sectors and conducted a pilot application pro- gram in 1995.

Forty-six healthcare and 19 education

organizations submitted applications. While

funding to expand the Baldrige Award to include categories for non-profit healthcare and education organizations was not available in 1998, NIST did revise the criteria for

these two sectors. NIST's fiscal year 1999

budget proposal includes $2.3 million to

establish Baldrige Award categories for

Prairie, Minn, (manufacturing); and

Marlow Industries, Dallas, Texas (small

business)

1990—Cadillac Motor Car Division,

Detroit, Mich, (manufacturing); IBM Rochester, Rochester, Minn, (manufacturing);

Federal Express Corp, Memphis, Tenn.

(service); and Wallace Co. Inc., Houston, Texas (small business)

1989—Milliken & Company, Spartanburg,

S.C. (manufacturing) and Xerox Corp. Business Products and Systems, Rochester,

N.Y. (manufacturing)

1988—Motorola Inc., Schaumburg, 111. (manufacturing); Commercial

Nuclear Fuel Division of Westinghouse

Electric Corp, Pittsburgh, Pa. (manufacturing); and Globe Metallurgical Inc.,

Beverly, Ohio (small business)

non-profit healthcare and education organizations. In addition, the private Foundation

for the Malcolm Baldrige National Quality

Award has initiated a fund-raising effort to provide an endowment of $15 million to help establish the awards, provided federal funding also is available.

Contact:

Baldrige National Quality Program

(301) 975-2036

email: nqp@nist.gov

fax: (301) 948-3716 A635 Administration Building

www.quality.nist.gov
MEASUREMENT AND

STANDARDS LABORATORIES

Higher quality products, more reliable and more flexible processes, fewer rejected parts,

speedier product development, more efficient market transactions, higher levels of

interoperability among machines, factories, and companies. These are some of the practical advantages that U.S. companies realize from the NIST Measurement and Standards

Laboratories' research, services, and standards-related activities. The ultimate U.S. ref- erence point for measurements with

counterpart organizations throughout the world, the laboratories provide companies,

entire industries, and the whole science and

technology community with the equivalent

of a common language needed in nearly

every stage of technical activity. In further- ing the technical aims and capabilities of

U.S. industry, the NIST laboratory program

serves as an impartial source of expertise, developing highly leveraged measurement

capabilities and other infrastructural technologies.

Several hundred laboratory projects are under way at NIST during a single year. Some relate to the evolving needs of mature

industries such as steel, machine tools, automobiles, and chemical processing. Others

concentrate on the technical challenges

confronting emerging industries such as

those sprouting from advances in nanotechnology or the ones facing established high-technology sectors undergoing rapid

technology change such as microwave

communications.

Collaborative Research

NIST actively seeks industrial, academic,

and non-profit research partners to work

collaboratively on projects of mutual benefit. Many mechanisms are available for carrying out these research collaborations.

Special efforts are made to tailor collaborations to specific needs.

Most research collaborations start with one-to-one interactions between industry or other researchers and NIST scientists and

engineers. To locate NIST researchers in specific fields of interest, see the project listings on pages 40 to 163. For further information about the process for implementing specific

types of research agreements, contact the

Industrial Partnerships Program,

(301) 975-3084.

The most common types of arrangements

include the following:

Cooperative Research and Development

Agreements (CRADAs)—Typically cover

joint research efforts in which both NIST

and the cooperating company provide staff, equipment, facilities, and/or funds, in any number of possible combinations, for a project of mutual interest. NIST currently is working with nearly 200 research partners on more than 200 CRADAs in nearly 130 different areas of research. NIST's CRADA partners are predominantly U.S. businesses, with about equal numbers from large and small companies.

When companies conduct joint research with the Institute under a CRADA, NIST can

protect confidential or proprietary information exchanged during the project, keep

research results confidential, and provide

exclusive rights for intellectual property developed during the course of the project. Each CRADA is negotiated separately between NIST and prospective partners. Most CRADAs take 3 to 4 weeks to implement.

Copies of a model NIST CRADA agreement

are available from the NIST Industrial Part- nership Program, (301) 975-5073-

Guest Researcher Agreements—Typically used when an industrial or other researcher wishes to join an ongoing NIST research

effort. The researcher gains access to NIST

research staff and facilities and, in return,

results from the collaboration are made

available publicly. Such agreements cannot

protect proprietary information and do not

allow cooperating companies to receive

exclusive intellectual property rights. Each

year NIST hosts about 1,250 guest scientists and engineers at its Gaithersburg, Md., and

Boulder, Colo., laboratories. Contact: domestic guest researchers, (301) 975-3084; inter- national guest researchers, (301) 975-4119.

Research and Development Contracts

Used when external organizations contract with NIST researchers to receive specific

technical services or results uniquely

available at the Institute. The cooperating

organization funds the NIST effort on a cost reimbursable basis. Individual contracts may provide protection of proprietary infor- mation under certain circumstances.

Research results are made publicly available, and any intellectual property rights

are retained by NIST. Preparation of contracts for such agreements typically takes about 4 weeks.

Informal Collaborations—Informal

one-to-one collaborations between Institute and other researchers. Such collaborations

often involve exchange of research results,

publicly available technical know-how,

and/or samples between NIST and other

researchers.
m MEASUREMENT AND STANDARDS LABORATORIES

Examples of NIST Lab Projects

The examples of recent accomplishments

described below are a small sampling of laboratory activities. They illustrate the ways in which NIST is carrying out its mission to provide infrastructural support to

U.S. industry.

• NIST measurements are vital to the functioning of the entire economy, helping to ensure fairness and efficiency in the

sale of more than $3 trillion worth of goods and services. Accurate and uniform measurements of weight, size, volume,

and other quantities maximize efficiency and promote customer confidence in the

sale of goods ranging from slices of lunch meat at the deli counter to millions of cubic meters of natural gas transported

through transnational pipelines.

• NIST measurements and standards are woven into the technical infrastructure underpinning the performance of companies in scores of established industries

from machine tools to photographic film

to medical devices. For example, the accuracy of coordinate measuring machines in thousands of factories is checked with measurement standards traceable to NIST

and applied according to industry- standardized procedures developed with NIST's technical assistance. In the auto- motive industry alone, more than 350

NIST-developed measurement tools and

services are embedded in the process- and

quality-control systems of companies.

• U.S. taxpayers are getting more than

they pay for from the NIST program

designed to ensure accuracy in measure- ments of radioactive drugs used to diagnose or treat disease, according to a

recent evaluation of NIST's radiophar- maceutical research. The study conservatively estimated that, since 1990, the program has cost taxpayers $2.4 million and yielded benefits worth $236.2 million,

a benefit-to-cost ratio of 97 to 1. The benefits represent money saved by patients and

drug manufacturers.

• NIST research on alternative refrigerants has generated a social rate of return

of 433 percent, the result of cost savings

realized by companies during the race to meet the international deadline for phasing out ozone-depleting chlorofluorocar- bons (CFCs). NIST expenditures of about

$2.7 million translated into savings total- ing about $14.2 million for a sample of 1

firms. Timely delivery of reliable data on

alternative refrigerants, along with analytical software, made the search for CFC

replacements more efficient.

• NIST and partners from Sandia

National Laboratories and the consortium SEMATECH recently developed a new refer- ence material that has potential to leapfrog several generations of measurement

needs forecast by semiconductor manufacturers. This reference material, evaluated by a consortium of 18 companies, is being

proposed as a tool for calibrating equip- ment that measures integrated-circuit features as tiny as 100 nanometers—about a thousandth of the width of a fine strand

of human hair.

• A NIST-led effort involving more than

25 companies has resulted in a standard

interface for integrating "smart"

transducers—combinations of digital sensors and actuators—into the more than

50 different types of proprietary computer

networks deployed throughout industry.

The standard, officially adopted by the

Institute of Electrical and Electronics Engineers (IEEE 1451.2), will broaden the choices available to manufacturers who

use sensors to monitor and control processes, and it will expand markets for the estimated 3,000 sensor and actuator manufacturers in the United States.

• A recently begun NIST calibration service is helping U.S. industry to improve

wireless telephone systems. A unique

indoor testing range is used to determine

the accuracy of specialized trumpetshaped antennas, which companies then

use to check the performance of communications antennas designed for low Earth

orbit satellites.

• Working with a consortium of 22 partners, NIST is helping companies evaluate

prototype products for adherance to the BACnet standard, which allows interoperability of heating, ventilating, and air conditioning control systems in buildings,

enhancing energy efficiency, safety, and

comfort. By developing conformance test- ing tools and procedures, the effort aims

to enable an industry-run certification program.

• The U.S. ceramics industy derives substantial economic benefits from the NIST

Ceramic Phase Equilibria Program,

according to an independent study. The

program's benefit-to-cost ratio is esti- mated at 10 to 1, and the internal rate

of return is estimated to be at least 33-5

percent. Phase equilibria diagrams help ceramic component manufacturers understand the effects of temperature, pressure, and material concentrations on the processing and properties of ceramic products.

• NIST developed the original computerized system the Federal Bureau of Investi- gation uses to match fingerprint evidence

against 38 million records, so that local

police can identify suspects. NIST

researchers now are working to link fingerprint biometrics with digital signatures, an accomplishment that would enable law enforcement agencies—as well as corporations and consumers—to make secure

electronic transactions.
MEASUREMENT AND STANDARDS LABORATORIES 37

Research Consortia

On research topics of broad interest to a number of different research partners, NIST may sponsor research consortia. Research

consortia usually are structured through NIST CRADAs and involve groups of companies and other organizations that exchange data, ideas, researchers, and/or

materials among themselves and with NIST

to meet agreed-upon research goals. Most

consortia require payment of membership

fees in exchange for advance knowledge of

research results produced by the consortia

effort. Currently active NIST-centered consortia include the following:

Flowmeter Installation Effects—Supports

research in fluid flow measurements to help

industry understand, evaluate, and assess flowmeter performance under non-ideal

installation conditions. Contact: George

Mattingly, (301) 975-5939-

North American Integrated Services Digital Network Users' Forum—Promotes the implementation and use of ISDN standards and the development of interoperable sys- tems for the simultaneous transmission of

voice, data, and images over high-speed

digital networks. Contact: Leslie Collica,

(301) 975-4856.

Monolithic Microwave Integrated Circuits—Develops metrology for design and

manufacture of microwave monolithic integrated circuits, especially measurement methods and standards to reduce testing costs.

Contact: Dennis Friday, (303) 497-3131.

Ceramic Machining Consortium—Devel- ops cost-effective production processes for grinding components made from advanced

structural ceramics, such as silicon nitride and silicon carbide. Contact: Said Jahanmir, (301) 975-4525.

BACnet Interoperability Testing—Works

to overcome communication barriers among building control systems from differ- ent manufacturers, making it possible to design truly "smart" buildings where all sys- tems work together and are controlled from

a central location. Contact: Steven Bushby,

(301) 975-5873.

Coatings Service Life Prediction—Devel- ops test methods to quickly and reliably predict the service life of painted products

exposed to the elements in order to help the

paint industry get better products to market more quickly. Contact: Jonathan Martin,

(301) 975-6707.

Computer-Aided Manufacturing Engineering—Develops standards and interfaces for a manufacturing engineering tool kit designed to allow software tools made by

different vendors with different engineering

functions to work together. Contact: Swee Leong, (301) 975-5426.

Enhanced Machine Controller—Develops

interface standards needed to produce an open architecture controller for manufacturing equipment that would allow machine

builders, users, and systems integrators to customize equipment more effectively,

reduce training and maintenance costs, and

make retrofitting of existing equipment with new capabilities more practical. Contact:

Fred Proctor, (301) 975-3425.

Orthopedic Accelerated Wear Resistance^—Helps shorten development and

approval time for new orthopedic implants

by identifying test methods with the greatest promise for accelerated screening of materials for wear resistance. Contact: John Tesk,

(301) 975-6799.

Environmentally Friendly New Flame

Retardants—Works to replace current fire

retardants with environmentally friendly

additives that reduce heat release rates of polymers used in carpets, upholstery, and

other products without increasing smoke

or carbon monoxide production. Contact: JeffGilman, (301) 975-6573-

NIST-EPRI Ultrasonic Flow Meter Testing

Program—Provides guidelines to improve

flow measurements in industrial environ- ments. NIST will assess ultrasonic flow meters from the consortium members by

testing their commercially available, clamp- on type, time-of-travel ultrasonic flow meters in both ideal and non-ideal pipe

flows. Contact: George Mattingly,

(301) 975-5939-

Optical Properties of Materials—Develops new standards and critically evaluated data on the optical properties of materials that

are important for evolving optical industries and manufacturing processes. Contact: Raju

Datla, (301) 975-2131.
38 MEASUREMENT AND STANDARDS LABORATORIES

Machine Tool Performance Models and

Machine Data Repository—Develops tools

to replace actual machining and inspection

of parts during prototyping with virtual machining and virtual inspection modules

incorporated into a CAD/CAM system. These

tools include data structures and low-order machine models that represent actual machine behavior; mathematical representations of actual part geometry, includ- ing dimension and form errors; virtual machining algorithms; virtual inspection

algorithms; standardized data formats; and remotely accessible machine data

repositories. Contact: Alkan Donmez,

(301) 975-6618.

Ceramic Processing Characterization Consortium—Develops new measurementbased strategies for ensuring reliable manufacturing by working with the U.S. ceramics

industry in the development of a measure- ments and standards infrastructure for ceramic particulate systems. Contact: George Onoda, (301) 975-4489.

Technical Assistance

NIST provides without charge informal technical advice to U.S. companies and others seeking assistance in specific areas. Often NIST experts can help a company solve a

technical problem through one or several phone conversations or a brief visit to the

Institute's Gaithersburg, Md., or Boulder,

Colo., laboratories. (Institute researchers are not permitted to consult on their own behalf

or to receive personal payments for technical advice in areas within NIST's mission.) See project descriptions on pages 40 to 163

to locate a NIST expert in a specific research

field or call General Inquiries for assistance,

(301) 975-NIST.

Technology Services and

Products

NIST provides many different technology

services and products to help U.S. industry

improve the quality, reduce the cost, and

increase the competitiveness of its products.

Summaries of the NIST programs providing

these services and products appear on pages

164 to 169. Examples include Standard Ref- erence Materials, Standard Reference Data, and calibration and laboratory accreditation

services.

Use of NIST Facilities

The Institute operates more than 40 different research facilities that are accessible to

outside researchers for collaborative or inde- pendent research. Several one-of-a-kind

facilities are available for proprietary measurements.

Access to NIST facilities generally occurs through one of four mechanisms: under the

provisions of a NIST CRADA or consortium

agreement; through a guest researcher agreement; through contract R&D in which

Institute staff members conduct specific experiments or tests at NIST and are reim- bursed for their time and supplies; and,

for a limited number of facilities, through

scheduled appointments for qualified

researchers wishing to conduct proprietary measurements.

Scheduling and priorities for NIST facilities use are determined by the relevant director

for each NIST disciplinary laboratory, in some cases assisted by designated user group

committees.

An index of NIST facilities appears on

page 170. For detailed information on capabilities and availability of individual facilities, call the contact person listed for that

facility. For general information on typical

facility use agreements, contact the Industrial Partnerships Program, (301) 975-3084.
MEASUREMENT AND STANDARDS LABORATORIES

Technology Licenses

NIST seeks patents for its product and process inventions when a patent will enhance

the invention's commercialization or use.

Individuals or companies may obtain a

license to use. make, or sell NIST patented

inventions, on either an exclusive,

co-exclusive, or non-exclusive basis. Normally licenses are granted only in cases where the licensee agrees that resulting

products will be manufactured substantially

in the United States.

The goal of NIST's licensing process is

to encourage commercial use of NISTdeveloped technologies. For a current listing

of the more than 100 NIST inventions available for licensing, contact the NIST Industrial Partnerships Program, (301) 975-4188.

Research Grants

Grants supporting research at industrial, academic, and other organizations are available on a competitive basis through several

different Institute offices. For general infor- mation on NIST grants programs, contact

Joyce Brigham, (301) 975-6329.

Small Business Innovation Research Pro- gram—Funds proposals by small businesses

for research and development efforts that

fall within areas recommended yearly by the

U.S. Department of Commerce. See

description on page 165.

Precision Measurement Grants—Supports

researchers in U.S. colleges and universities

for experimental and theoretical studies of fundamental physical phenomena. Contact:

(301) 975-4220.

Fire Research Grants—Sponsors research by academic institutions, non-federal gov- ernment agencies, and independent and

industrial laboratories that supports NIST's

fire research laboratory programs. Contact:

(301) 975-6854.

Standard Reference Data Grants—Supports research at academic, industrial, and

other non-federal institutions to critically

evaluate data in chemistry, physics, and

materials properties. Contact:

(301) 975-2200.

Materials Science and Engineering

Grants—Supports work in polymers, ceramics, metallurgy, and neutron scattering and

spectroscopy research at academic, industrial, and other non-federal institutions.

Contact: (301) 975-5731.
BUILDING AND FIRE

RESEARCH LABORATORY

COOPERATIVE RESEARCH

OPPORTUNITIES

The Building and Fire Research Laboratory (BFRL) enhances the competitiveness of U.S. industry and public safety through performance prediction methods, measurement technologies, and

technical advances that improve the lifecycle quality and economy of constructed

facilities. BFRL's efforts are closely coor- dinated with industry, professional and

trade organizations, academe, and other agencies of government.

Major BFRL goals are to improve the productivity of U.S. construction industries, which now face stiff competition from

overseas firms, and to reduce the human

and economic losses resulting from fires, earthquakes, winds, and other hazards. The laboratory conducts research in fire science and fire safety engineering; build- ing materials; computer-integrated construction practices; structural, mechanical, and environmental engineering; and building economics. Products of the laboratory's research include measurements and test methods, per- formance criteria, and technical data

that are incorporated into building and

fire standards and codes. Staff members

are involved in more than 100 activities

to develop voluntary standards.

The laboratory conducts investigations at the scene of major fires and structural

failures due to earthquakes, hurricanes, or other causes. The knowledge gained from these investigations guides research and is applied to recommendations for design and construction practices to reduce hazards.

Contact: Richard N. Wright, Director

(301) 975-5900

email: richard.wright@nist.gov

fax: (301) 975-4032 B216 Building Research Building

www.bfrl.nist.gov

COOPERATIVE RESEARCH

OPPORTUNITIES

Structures

40 Earthquake Engineering

41 Structural Control

Building Materials

41 Cement and Concrete

41 Organic Building Materials 42 High-Performance Construction

Materials and Systems

42 Construction Materials Reference

Laboratories

Building Environment

43 Indoor Air Quality and Ventilation

43 Refrigeration Machinery

43 Heat Transfer

44 Building Controls 44 Computer-Integrated Construction

Fire Safety Engineering

45 Fire Detection and Alarm

45 Large Fires

45 Fire Dynamics

Fire Science

46 Advanced Fire Sensing

46 Advanced Fire Suppression

46 Measuring Fire Accurately 47 Polymer Combustion Research

Applied Economics

47 Microeconomic Analysis

RESEARCH FACILITIES

48 Large-Scale Structures Testing Facility 48 Tri-Directional Test Facility

48 Large Environmental Chamber

49 Calibrated Hot Box

49 Line Heat-Source Guarded Hot Plafe

50 Advanced Insulation Facility

STRUCTURES

Division Contact: Shyam Sunder

(301) 975-6713

email: sunder@nist.gov

fax: (301) 869-6275 B166 Building Research Building

www.bfrl.nist.gov/86l/structd.html

EARTHQUAKE

ENGINEERING

The National Earthquake Hazards Reduction Program mandates NIST to conduct

research and development in earthquake

engineering. These efforts improve building

codes and standards and advance seismic

practices for structures and lifelines. Research is carried out to improve seismic design and construction standards. Results

are applied to improve construction practices for both new and existing buildings,

structures, and lifelines. Post-earthquake

investigations are performed to study the per- formance of structures and lifeline systems during major seismic events. The findings

are vital for improvement of design and construction practices. Guidance and technical support are provided to the Interagency Committee on Seismic Safety in Construction of

the National Earthquake Hazards Reduction Program in support of its efforts to develop

recommended practices for federal agency

use. Current research addresses these topics:

• strength and ductility of connections in

precast concrete structures;

• evaluation criteria for structural control systems and test procedures for evaluating

the response of structures subjected to seis- mic loading;
BUILDING AND FIRE RESEARCH LABORATORY

• a rational procedure to determine the ulti- mate shear strength of partially reinforced masonry walls;

• techniques for assessing the performance

properties of strengthened existing structures;

• strengthening methodologies for concrete frame structures;

• developing technical criteria and methodologies for strengthening and repairing exist- ing structural members and systems; and

• techniques for determining liquefaction and ground deformation potential of soil

deposits.

Contact:

Riley Chung

(301) 975-6062

email: riley.chung@nist.gov B158 Building Research Building

STRUCTURAL CONTROL

NIST carries out research that provides the

technical basis for criteria that ensure structural safety7 and serviceability of buildings and other structures. Studies are performed

to develop the technical basis for removing

barriers to the use of new high-performance

construction materials and systems. Research in construction automation seeks

to develop, integrate, and implement new

technologies that will permit generalized automation at the construction job site. Work in wind research is aimed at developing key elements of a knowledge-based wind

load design standard that will use site- and

building-specific databases and state-of-theart computational methods to establish realistic, consistent, and economical steady and

fluctuating structural loads. Current

research addresses the following areas:

• studies of structural performance measurement standards and test methods for high-performance concrete for construction

applications;

• establishment of design wind loads for low-rise structures;

• non-destructive testing methods to detect internal flaws and discontinuities in structural members; and

• response measurements of full-scale

structures.

Contact: Nicholas Carino

(301) 975-6063

email: nicholas.carino@nist.gov

B158 Building Research Building

BUILDING MATERIALS

Division Contact:

Geoffrey J. Frohnsdorff

(301) 975-6706

email: geoffrey.frohnsdorff@nist.gov

fax: (301) 990-6891 B368 Building Research Building

www.bfrl.nist.gov/862/bmd.html

CEMENT AND CONCRETE

NIST researchers are developing a funda- mental understanding of the relationship between chemistry, microstructure, performance, and service life of conventional and

high-performance concrete and other inorganic building materials. Their goal is

to develop tools for predicting the behavior

of these materials and their service lifetimes. Because the service life of concrete largely depends on the transport of water, dissolved

salts, and gases in the pore system of the

concrete, researchers are developing mathematical representations of the microstructure of concrete and models for use in

predicting its diffusivity and permeability.

Models are being developed to consider service conditions, including the chemistry of

the environment; the transport rate of reactants by diffusion, convection, and capillarity; and reaction mechanisms.

Research projects include development and

validation of models for simulating microstructure development in cement pastes as

the cement hydrates and the degradation of

concrete. Artificial intelligence systems are being developed for optimizing the selection

of materials and for diagnosing the causes

of material degradation. Experimental studies are being performed on the rheology of concrete aimed at improving the design of mixture proportions. The research is performed using a variety of techniques,

including scanning electron microscopy,

computerized image analysis, X-ray diffraction, and thermal analysis.

This work helps the U.S. construction industry to be competitive by providing a strong

technical basis for standards for concrete and concrete materials. The research is coor- dinated with industry, voluntary standards

organizations, trade associations, the National Science Foundation's Center for Advanced Cement-Based Materials, and

federal and state government agencies.

Contact: James R. Clifton (301) 975-6767

email: james.clifton@nist.gov

B350 Building Research Building

ORGANIC BUILDING

MATERIALS

NIST is conducting basic and applied research to develop methods for predicting

the performance and service life of organic

building materials such as protective coatings for steel, polymer-matrix composites, and roofing materials. In addition, researchers are developing a systems approach to advancing the science of appear- ance measurements for coated objects.

Researchers are investigating degradation

mechanisms, improving characterization methods, and developing mathematical

models of the degradation processes. Stochastic models, which are based in reliability theory and life-testing analysis, are
BUILDING AND FIRE RESEARCH LABORATORY

included in the modeling efforts for all three

of these materials.

To help understand the mechanisms of degradation and to provide data for models,

materials are characterized in many ways, including Fourier transform infrared spectroscopy, thermal analysis, scanning elec- tron microscopy/energy dispersive X-ray, and visual and infrared imaging.

Researchers also are developing improved ways to characterize atmospheric environ- ments to which these materials are exposed. Characterization of environmental parameters that cause degradation is needed to link material properties with service life.

Researchers are using a systems approach to advance appearance metrology by applying

optical metrology, mathematical modeling, and computer rendering, which have been

developed over the last decade, to the devel- opment of new methods for appearance

characterization and more accurate methods of modeling the appearance of coatings

and coated objects. Application of advanced

optical technologies, such as goniophotometric detectors, light scattering, and

imaging, coupled with advanced computational technology, will result in more

comprehensive understanding of appear- ance parameters. New detector technologies

offer the potential of making low-cost, image-based measurement devices for characterizing appearance, rather than the commonly used simple wide-angle, source/

detector-based measurement devices. Parameterized mathematical models and computer rendering, when coupled with advanced measurements, will allow

researchers and engineers to assess the contribution of a coating's constituents and

microstructure to its appearance and help

them design coatings with appropriate

initial appearance and durability properties.

The NIST research strengthens the scientific and technical basis for engineering standards for organic building materials devel- oped by voluntary consensus standards

organizations. Sometimes, as is the case in

the Coatings Service Life Prediction Consortium, the research is supported by and

carried out in close collaboration with industry and other federal agencies.

Contact: Jonathan W. Martin

(301) 975-6707

email: jonathan.martin@nist.gov B350 Building Research Building

HIGH-PERFORMANCE

CONSTRUCTION

MATERIALS AND SYSTEMS

NIST's High-Performance Construction

Materials and Systems Program is a BFRLwide research program. It supports the national High-Performance Construction

Materials and Systems Program (CONMAT),

which the Civil Engineering Research Foundation and 10 industry groups established

"to develop the high-performance construction materials and systems necessary for America's well-being and international competitiveness in the 21st Century." The NIST

program involves four of BFRL's divisions

Structures, Building Materials, Fire Sciences, and Fire Safety Engineering—and its

Office of Applied Economics. The program

encompasses high-performance concrete,

steel, polymer-matrix composites, organic

coatings, and roofing materials. Researchers

are developing rational methods for evaluating, by measurement or prediction, all major aspects of performance—structural,

durability, and fire resistance. The program

is providing a testbed for collaboration with

industry in development of a computerintegrated knowledge system for

high-performance construction materials and systems. The results of the NIST pro- gram will facilitate acceptance of new and

improved construction materials by the construction industry.

Contact:

Geoffrey J. Frohnsdorff

(301) 975-6706

email: geoffrey.frohnsdorff@nist.gov B368 Building Research Building

CONSTRUCTION

MATERIALS REFERENCE

LABORATORIES

NIST's Construction Materials Reference

Laboratories (CMRL), managed by BFRL,

comprise the ASTM-sponsored Cement and

Concrete Reference Laboratory (CCRL)

founded in 1929 and the AASHTO (American

Association of State Highway Transportation

Officials)-sponsored AASHTO Materials Ref- erence Laboratory (AMRL) founded in 1965. The laboratories provide a reimbursable, vol- untary, quality assurance service for more

than 1,200 commercial and other laboratories that test construction materials for compliance with standards—ASTM standards

for cements and other concrete materials in

the case of CCRL, and AASHTO standards for almost the full range of highway construction materials in the case of AMRL. The services of both laboratories comprise laboratory

inspections by CMRL's staff of inspectors and operation of large proficiency sample

programs. CMRL has been described as "an outstanding example of governmentindustry collaboration" for its contributions

to the quality of construction.

Contact: James H. Pielert (301) 975-6746

email: james.pielert@nist.gov A365 Building Research Building
BUILDING AND FIRE RESEARCH LABORATORY

BUILDING ENVIRONMENT

Division Contact: James E. Hill

(301) 975-5851

email: james.hill@nist.gov

fax: (301) 975-5433 B306 Building Research Building www.bfrl.nist.gov/863^ed.html

Measurement procedures are being devel- oped and demonstrated to evaluate build- ing ventilation and indoor pollutant

concentrations. These procedures range from sophisticated tracer gas methods used predominantly in building research efforts

to less involved procedures that can be employed by building operators. NIST

researchers are developing new test proce- dures and demonstrating them in the field

to evaluate their feasibility and reliability. These efforts have resulted in the develop- ment of an important database of building

ventilation and indoor air quality

performance.

Contact: Andrew K. Persily (301) 975-6418

email: andrew.persily@nist.gov A313 Building Research Building

REFRIGERATION

MACHINERY

NIST researchers identify and characterize

refrigerant and refrigerant mixtures to improve the efficiency of refrigeration cycles and replace harmful chlorine-containing

refrigerants that were implicated in the destruction of the upper- atmosphere ozone

layer. The researchers evaluate alternative

refrigerant cycles, systems, and components

that will operate efficiently with new refrigerants. Working with industry, they improve

capabilities in determining the performance

of alternative refrigerants and help refrigeration equipment manufacturers in designing

refrigeration systems.

The researchers evaluate alternative refrigerants and a wide variety of refrigeration

cycles by using a breadboard heat pump into which different components and circuits can

be "plugged" and "unplugged." These

breadboard modifications are based on theoretical and simulation studies conducted to

find the optimal combination of mixtures and appropriate refrigeration cycle for the

best and most versatile performance. Fluoro- carbon and hydrocarbon refrigerants are

studied in novel applications like a waterto-water heat pump or a heat pump with

evaporative cooling of the high-pressure

refrigerant. In addition to simulation and

laboratory studies, pool-boiling and flow- boiling heat-transfer coefficients are measured for alternative refrigerants and

refrigerant mixtures, including tests with

pool-boiling additives.

Contact:

Piotr A. Domanski

(301) 975-5877

email: piotr.domanski@nist.gov Bl 14 Building Research Building

HEAT TRANSFER

In the United States, buildings account for over 60 percent of all electricity used and

almost 40 percent of all natural gas con- sumed, at an annual cost that exceeds $170

billion. A significant portion of this energy is used to provide space heating and cooling. Researchers at NIST are developing basic data and simulation models for heat, air, and moisture transfer through building

envelope components. They developed

MOIST, a widely used computer model for predicting moisture transfer within the building envelope. They are developing a Standard Reference Material (SRM) that

will be used to calibrate private-sector facilities for measuring thermal performance of windows while maintaining the supply of three other SRMs used to calibrate insulation manufacturers' "in-house" instrumentation. In addition to conducting measurements for industry on conventional

building insulation products, researchers within the heat transfer group are developing measurement techniques to assess the thermal performance of new insulation products with superior thermal performance. A

study currently is being conducted to deter- mine the energy-savings potential of reflective roofing materials.

INDOOR AIR QUALITY

AND VENTILATION

Computer simulation programs and meas- urement procedures are being developed and

applied by NIST researchers to better understand the phenomena of air and contami- nant transport in buildings and to support

industry efforts to improve environmental

conditions in buildings in a cost-effective manner. The results of this research are providing reliable methods to design buildings and heating, ventilating, and air- conditioning (HVAC) systems and to evaluate ventilation characteristics and

indoor pollutant concentrations in buildings.

The modeling efforts include the develop- ment and application of multizone airflow and indoor air quality models, specifically

the CONTAM series, which predicts airflows and contaminant concentrations in multi- zone building systems. CONTAM has been

used at NIST to study the indoor air quality

impacts of HVAC systems in single-family

residential buildings, ventilation in large mechanically ventilated office buildings, and radon entry and transport in large

residential, office, and school buildings.
BUILDING AND FIRE RESEARCH LABORATORY

A 1 -meter guarded hot plate is used to develop SRMs; to determine thermal conductivity values for various materials, such as chlorofluorocarbon-blown insulation; and

to provide measurement services to manufacturers and researchers. A calibrated hot box is used to measure the steady-state and

dynamic performance of full-scale wall sys- tems. A calorimeter and finite-element models are used to characterize the performance

of advanced insulation systems such as gasfilled and vacuum insulation panels.

This work provides the national "meter bar"

for the thermal insulation industry. All

advertised thermal insulation product per- formance is traceable to measurements made in this program.

Contact:

A. Hunter Fanney

(301) 975-5864

email: hunter.fanney@nist.gov

B320 Building Research Building

BUILDING CONTROLS

NIST research is fostering the development

of more intelligent, integrated, and opti- mized building mechanical systems. A dynamic building heating, ventilating, and

air-conditioning (HVAC) control system simulation program is used to study HVAC

control system dynamics and interactions. An expanded building management and controls laboratory is used to assist the building

controls industry in the development, evaluation, and testing of communication protocol standards for the open exchange of information. NIST technologies serve as a

basis for American Society of Heating, Refrigerating and Air-Conditioning Engineers

standards to assist the control system manufacturers in developing interoperable sys- tems and methods for testing conformance

to the standard.

The application of "smart" control systems

to buildings is a relatively new area of

research. Plans call for exploring how real- time models, on-line system identification, optimal control, and fault detection and

diagnostics can be combined to improve

control system performance, make control

strategy decisions that optimize building

operations, and advise the building operator

or manager on building operations, equip- ment problems, or maintenance require- ments. Research on smart building control systems will be performed by simulation and

emulation studies, laboratory testing, and

field studies in real buildings.

Contact: George E. Kelly

(301) 975-5870

email: george.kelly@nist.gov Bl 14 Building Research Building

COMPUTER-INTEGRATED

CONSTRUCTION

NIST researchers are working collaboratively with the U.S. construction and build- ing industries to establish an exemplary

computer-integrated construction environ- ment, based on open standards for the representation, access, exchange, use, and

archiving of information. With these standards implemented in software systems, industry will be able to achieve its goal of seamlessly circulating information throughout its life-cycle work processes, all taking

place in a loosely coupled, distributed, het- erogeneous environment.

Current research is concentrated in three

areas: the integration of project information, the integration and automation of

activities on the construction site, and the

electronic commerce of technical information between supplier and project. The out- put of this research is prototype standards and protocols, measurement technologies, and testing procedures. Experiments to evaluate and demonstrate these outputs are conducted in a testbed that is open to industry and academia.

The near-term focus of the research has been in support of the heavy industrial construction sector, dealing with capital projects such as chemical process plants. To

ensure that its research is addressing industrial needs, NIST participates in industrial consortia such as PlantSTEP, Inc., and the pdXi (Process Data Exchange Institute) of

the American Institute of Chemical Engineers and in committees of the Construction

Industry Institute. The focus is being broad- ened to other industry sectors as the research matures and industrial partnerships are established.

NIST researchers are exploring current and

emerging information technologies in this program, including traditional dataoriented and emerging object-oriented technologies, and new communication and

collaboration technologies made possible by

the Internet. A major theme of NIST

research is the harmonization of different technologies to allow industry maximum

flexibility in choosing technologies to meet

its needs. The computer-integrated construction program draws on researchers throughout BFRL and works cooperatively with other NIST programs, including the Systems Inte- gration for Manufacturing Applications pro- gram managed by the Manufacturing

Engineering Laboratory.

Contact:

Kent A. Reed

(301) 975-5852

email: kent.reed@nist.gov B306 Building Research Building
BUILDING AND FIRE RESEARCH LABORATORY

FIRE SAFETY

ENGINEERING

Division Contact: David D. Evans

(301) 975-6897

email: dave.evans@nist.gov

fax: (301) 975-4052 B250 Polymer Building

www.bfrl.nist.gov/864/fsed.html

FIRE DETECTION AND

ALARM

The United States has one of the worst fire records in the industrialized world. NIST

researchers are helping to reduce the losses and the cost of fire safety by providing

scientific and engineering bases needed by manufacturers and the fire safety community. This work involves the development of

predictive, analytical methods that permit

the quantitative assessment of fire condition

in structures. To ensure widespread use, the necessary input data must be readily available and results must be readily understood

by the user. This research includes strong emphasis on numerical modeling, databases, state-of-the-art computer graphics, and computer-aided design techniques. The

results of this work help manufacturers, purchasers, designers, code officials, fire investigators, and practitioners evaluate the fire hazard implications of the products and fire protection strategies they use.

The expedient transfer of scientifically based

technology from NIST to the professional user community and the creation of a link between NIST computer-based activities and

others doing similar or complementary work

can enhance fire safety and reduce its costs. Over the past decade, NIST researchers devel- oped many computer models of various

aspects of fire. These researchers develop

engineering systems for design application and fire investigation, collect supporting

data and programs, and operate training programs and user workshops.

NIST is developing fire data management

systems and databases to facilitate the transfer and availability of fire data. The emphasis is on reducing the loss of life and

property through innovative use of detection and control of fires and fire service response. As part of the mission of the group, the collection and exchange of data for fire science and engineering is promulgated through

activities such as the Fire Research Information Service.

Contact: Walter W.Jones

(301) 975-6887

email: wwj@nist.gov A249 Polymer Building

LARGE FIRES

Large fires result from industrial or transportation accidents, natural disasters, arson, or when fire protection systems in constructed

facilities fail to perform adequately. While

these fires present a hazard to building

occupants, firefighters, and the surrounding

area, little is known about their characteristics, their growth and control, and methods of mitigating their impact. NIST is performing research and developing tech- niques to measure and predict the behavior

of large fires and the action of building fire

protection systems. Large building fires involve the interaction of strongly buoyant

gas flows and thermal radiation with complex structures and, in some cases, automatic fire suppression systems. Experiments to evaluate industrial fire behavior and the performance of fire suppression systems are being conducted to provide information that can be used to reduce vulnerability to large

fires.

NIST is a leader in field fire measurement.

Information from these studies, performed

at sites of opportunity in cooperation with

industry and fire service organizations,

provides valuable data not obtainable in laboratory experiments. The development of robust field measurement techniques and

equipment is a continuing activity. Data are used to develop and evaluate predictive models and standard test methods. As an

example, NIST measures smoke plumes

from large, open-air oil-spill fires to help

develop and evaluate computer models for smoke movement.

Contact: Daniel Madrzykowski

(301) 975-6677

email: madrzy@nist.gov

A345 Polymer Building

FIRE DYNAMICS

The ability to make quantitative predictions

of the hazards associated with fires in industrial, commercial, and residential facilities

rests on an understanding of fire dynamics and the underlying physical principles that control these phenomena. The understanding of fire dynamics is gained from computer simulations based on advanced

large eddy simulation techniques in computational fluid dynamics and laboratory

experiments. The result is a system of analysis that relies on sophisticated computational and measurement tools to predict the impact of fires.

These techniques have been applied at NIST

to study a variety of diverse fire response

issues such as the dispersion of smoke

plumes from oil-spill fires and the control

of warehouse storage-rack fires using draft

curtains, sprinklers, and vents. The unique NIST contribution has been the quantitative

prediction of critical parameters such as the ground-level deposition of smoke particulate from oil fires and the time sequence of sprinkler activation in storage-rack fires. NIST is developing a system to predict the spread of

fires in urban areas following earthquakes
BUILDING AND FIRE RESEARCH LABORATORY

and other natural disasters. This system will involve both a computational wind engineering capability and an enhanced fire prediction methodology. The resulting

methodology will be used to assist in disaster response planning in both industry and

government.

Contact: Daniel Madrzykowski

(301) 975-6677

email: madrzy@nist.gov

A345 Polymer Building

FIRE SCIENCE

Division Contact: Richard Gann

(301) 975-6866

email: richard.gann@nist.gov

fax: (301) 975-4052 B250 Polymer Building

www.bfrl.nist.gov/865/fsd.html

ADVANCED FIRE

SENSING

The damage from fires that are detected quickly can be kept small. NIST researchers

are studying new "fire signatures" that would enable the development of a new generation of detectors. The signals from these

detectors would be analyzed electronically to

alert occupants or suppression devices, per- haps even before flames exist. The research

also is intended to provide an understanding

of technology for avoiding the high false- alarm rate of current detectors. In addition, advanced concepts for fire suppression

chemicals, reduced explosion potential, and

minimizing collateral damage from the application of the suppressant are being

explored.

NIST also is developing a first-generation, fire-emulator/detector-evaluator. Identified by industry as a principal stimulant to the development and commercialization of new

fire alert devices, the emulator will provide a well-controlled environment in which fire sensors can be exposed to highly reproducible, time-varying concentrations of combustion products at predetermined temperatures and flow velocities. This will provide accurate determination of the sensitivity and utility of new detector designs.

Using this device will demonstrate the response of discriminating detector systems

to early fire events and will enable improved

fire protection with reduced cost and losses.

Contact: William Grosshandler

(301) 975-2310

email: william.grosshandler@nist.gov

B356 Polymer Building

ADVANCED FIRE

SUPPRESSION

Rapid, effective response to a fire is essential

to improve life safety and avert major property loss. Halon fire suppressants have long been used to protect the most important, sensitive, and irreplaceable facilities. Production of these chemicals now has been halted due to their deleterious effect on strato- spheric ozone.

In performing leading research into replace- ments for the halons, NIST is working

closely with the industries and federal agencies that need alternative suppression capability, the potential manufacturers of advanced fire suppression technologies,

and other researchers in the field. NIST

researchers are studying the mechanisms of highly efficient flame extinguishants to help

identify new chemicals for practical use, investigating the transport properties of gaseous and liquid suppressants to optimize

their effectiveness, and developing perform- ance measures for new fire suppression

technologies.

Contact: William Grosshandler

(301) 975-2310

email: william.grosshandler@nist.gov B356 Polymer Building

MEASURING FIRE

ACCURATELY

The modern fire-safety professional has become dependent on quantitative measures

of fire performance, whether in terms of

specifying commercial products or in presuming the validity of the ever more

pervasive fire models. This requires that the measurement methods themselves be of

reliable accuracy and known precision. However, nearly all the current fire- characterization techniques have been in use for decades and have not incorporated

the great strides made in instrumentation and data acquisition abilities. In addition,

these techniques carry systematic and ran- dom errors that have not been adequately

characterized, making questionable their

reliability in safety assessments.
BUILDING AND FIRE RESEARCH LABORATORY

NIST research is directed at modernizing

fire measurements. The focus is on several

areas:

• determining the needs of the fire community and analyzing the capability of current measurement approaches to meeting those

needs;

• improving standard procedures for measuring temperatures in fire environments

using thermocouples;

• developing a new and universal method

for measuring smoke production in fullscale fire tests; and

• assessing the potential for new laser

optical techniques for temperature and

concentration measurements in harsh fire environments.

The results will enable the development of more accurate fire models and will enhance

confidence in the ability of fire-model- dependent, performance-based fire codes to provide an ensured level of safety.

Contact: William Pitts

(301) 975-6486

email: william.pitts@nist.gov B258 Polymer Building

POLYMER COMBUSTION

RESEARCH

The materials industry is seeking products

with low flammability that will not pose environmental hazards over their life cycles. NIST is working on several key research ar- eas needed to produce natural and synthetic

polymer and composite materials that can meet these goals. One area is the measure- ment of flammability properties by benchscale methods directly relevant to real fires. Also important is the development of mathematical models that use the measured flammability properties as inputs to predict fire performance of materials in the conditions

of actual use.

Another research area concerns approaches

to environmentally acceptable, charforming

flame retardant treatments for flaming and

smoldering combustion. This effort includes studying the physical and chemical nature

of char and how its properties can be enhanced. Theoretical modeling using molecular dynamics and quantum mechanics complement the experimental work to develop a technical basis for the design of a new generation of fire-resistant materials, which, while retaining their intended-use

properties, will be low in combustion toxicity and safe for the environment.

Contact: Takashi Kashiwagi

(301) 975-6699

email: takashi.kashiwagi@nist.gov B258 Polymer Building

APPLIED ECONOMICS

Office Contact: Harold Marshall

(301) 975-6131

email: harold.marshall@nist.gov

fax: (301) 208-6936 B226 Building Research Building

MICROECONOMIC

ANALYSIS

The Office of Applied Economics (OAE)

conducts research and provides technical

assistance in the field of microeconomic

analysis. It provides information to decision makers in the public and private sectors who

are faced with choices among new technologies and policies relating to manufacturing,

industrial processes, the environment,

energy conservation, construction, law

enforcement, and safety. The OAE also devel- ops and conducts prototype training pro- grams in applied economics for scientists and engineers.

Benefit-cost analysis, life-cycle costing,

multicriteria decision analysis, risk analysis, and econometrics are techniques the OAE

uses to evaluate new technologies, processes, governmental programs, legislation, and

codes and standards to determine efficient

alternatives. Research areas include energy

conservation in buildings, fire safety, auto- mation, seismic design, and building eco- nomics. Products include reports of research

findings, standard methods and guidelines

for making economic evaluations, audiovisuals that teach and illustrate methods in

practice, and decision-support software with documentation.

Currently researchers are developing and

automating a decision-support system, BEES, for evaluating the environmental and economic performance of buildings; developing models and software for evaluating the

life-cycle cost effectiveness of composites

and other new technology materials in construction; constructing an optimization

model for determining the appropriate

prices and levels of production for NIST's Standard Reference Materials; and providing

economic software tools for evaluating the long-term cost effectiveness of capital invest- ments in buildings and building

components.

Contact: Harold Marshall

(301) 975-6131

email: harold.marshall@nist.gov

fax: (301) 208-6936 B226 Building Research Building
48 BUILDING AND FIRE RESEARCH LABORATORY

RESEARCH

FACILITIES

LARGE-SCALE

STRUCTURES TESTING

FACILITY

The NIST large-scale structures testing facility consists of a universal testing machine

(UTM) that may be used with a 13.7-meter- high reaction buttress equipped with a hori- zontal hydraulic ram of 4.5 MN capacity. A combination of horizontal and vertical

forces may be applied to large-scale specimens.

CAPABILITIES The UTM portion of the facility is a servocontrolled, hydraulically operated machine

of 53-4 MN capacity and is one of the largest

in the world. It can be programmed by function generator or computer to create any

desired loading function using force, strain, or displacement as the variable. It tests large

structural components and subassemblies and applies the forces needed to calibrate very large capacity force-measuring devices.

It can apply compression forces to test sections up to 18 m in height. The reaction buttress will resist horizontal forces to 4.5 MN

from floor level to 12.2 m high. Flexure and

tension specimens may be subjected to

forces up to 18 MN and 26 MN, respectively. Two-meter-thick test floors may be used to

tie specimens in place.

APPLICATIONS A testing program was conducted to evaluate

the performance of concrete columns 1.5 m

in diameter and up to 9-1 m high. Another

test series evaluated fracture propagation in

steel plates 1 m wide and 0.1 m and 0.15 m

thick. A third experiment used the servo- control system, programming repeated loads applied to composite specimens.

Low-cycle fatigue tests, destructive or ulti- mate loads, earthquake simulation in two

dimensions, and complex loading of components may all be accomplished in this

facility. Servo operation of this machine

creates a unique potential for applying

precisely controlled very large forces to test components.

AVAILABILITY

This facility, which NIST staff must operate,

is available for cooperative or independent

research. Tests should be arranged as far in advance as possible as special hardware may

be needed for attaching specimens.

Contact: Shyam Sunder

(301) 975-6713

email: sunder@nist.gov B166 Building Research Building

TRI-DIRECTIONAL

TEST FACILITY

The tri-directional test facility at NIST is a computer-controlled apparatus capable of applying cyclic loads simultaneously in three directions. It is used to examine the strength and deformation characteristics of

structural components or assemblages under the application of a variety of loadings, such as earthquake or wind. This is one of the largest facilities in the United

States, in terms of both its high load capacity and its capability to handle large, fullscale specimens.

CAPABILITIES The facility can apply forces or displace- ments or both in six directions. Specimens up to 3-3 m high x 3 m in length or width may be tested. The six degrees of freedom

are translations and rotations in and about

three orthogonal axes. Six closed-loop, servo-controlled hydraulic actuators apply

forces or displacements. Loads may be

applied up to 2,000 kN in the vertical and

about 890 kN in each of the two horizontal

directions.

APPLICATIONS The test facility is limited only by the size of the test specimen. Loads may be cyclic or monotonic depending on the type of loading

condition being simulated. The facility is used to study masonry shear walls subjected

to reverse cyclic lateral loading and precast concrete beam-column and wall connections, also subjected to reversed cyclic lateral loading. This facility supports NIST's role in conducting research for the development of seismic design and construction standards

in the National Earthquake Hazards Reduction Program.

AVAILABILITY The tri-directional test facility is used by NIST staff in a variety of NIST research projects and in collaborative projects with other

agencies. It also is available for independent

research but must be operated by NIST staff.

Contact: Shyam Sunder

(301) 975-6713

email: sunder@nist.gov

B166 Building Research Building

LARGE ENVIRONMENTAL

CHAMBER

The large environmental chamber is

14.9 m x 12.8 m x 9.5 m high. It has an

earth floor and may be excavated as needed

for building construction. The chamber is one of the largest of its kind, capable of accommodating two-story houses under

simulated environmental conditions. This chamber has been used for thermal performance, heating and cooling load measurements, and energy consumption studies of buildings of different kinds.
BUILDING AND FIRE RESEARCH LABORATORY

CAPABILITIES The chamber is capable of automatically

maintaining steady and/or dynamic temperature profiles from -45 °C to 65 °C and

humidity from 50 percent relative humidity

(rh) at 1.7 °C up to 35 °C dewpoint at 49 °C. A wider range of rh (15 percent to 80 percent) may be obtained manually. Air circulation maintains the temperature variation within the chamber to within ±1 °C. Damper-control return ducts in all four cor- ners of the chamber permit good air distribution. Supply air is furnished by ceiling

diffuse rs.

APPLICATIONS The chamber is used to measure indoor temperature fluctuation, heat loss and heat gain

through building envelopes, energy conservation and moisture condensation studies, and air infiltration under simulated and

dynamically fluctuating outdoor temperature cycles. The chamber has been used to

test a variety of conventional and special structures and equipment, including military hardware (such as inflatable life rafts, relocatable air-inflatable hospital units, and

portable walk-in coolers) under extreme cli- matic conditions.

AVAILABILITY This facility, along with several smaller chambers (including one designed for vehicles), has substantial potential for use by

researchers in industry and universities. Collaborative programs and proprietary research can be arranged.

Contact:

Piotr A. Domanski

(301) 975-5877

email: piotr.domanski@nist.gov

Bl 14 Building Research Building

CALIBRATED HOT BOX

The NIST calibrated hot box measures the heat transfer coefficient of full-scale build- ing wall sections. Designed according to ASTM Standard C976, it consists of two

large, heavily insulated chambers—an envi- ronmental chamber and a climatic chamber—each with one open side. Indoor and

outdoor conditions are simulated in the chambers. The open test section measures

3 m x 4.6 m. A well-insulated frame supports the wall specimen clamped between

the open sides of the two chambers.

CAPABILITIES This facility is the only one of its kind

designed to perform simultaneous dynamic

transfer measurements of air, moisture, and

heat during simulated winter and summer

conditions under steady-state and dynamic

climatic conditions. While the environ- mental chamber temperature and humidity

are maintained to simulate a relatively steady and narrow range of indoor conditions, the climatic chamber can attain temperatures ranging from -40 °C to 65 °C. The apparatus measures the performance of homogeneous or composite walls having a range of thermal resistance from 0.35 m to 8.8 m • C/W. It accommodates wall speci- mens up to 0.6 m thick and up to 700 kg/m

2

in weight per unit area.

APPLICATIONS NIST researchers use the facility to develop standard test methods to evaluate dynamic

thermal performance of full-scale walls under cyclic temperature conditions. The

building industry and government agencies

are seeking reliable evaluation techniques

for wall thermal mass, especially to predict energy consumption of buildings with heavy mass effects in comparison to standard wood-frame buildings.

NIST has participated in round-robin test

activities with domestic and overseas ther- mal insulation laboratories.

AVAILABILITY The facility provides a unique opportunity to measure simultaneous transfer of air, moisture, and heat through wall and roof speci- mens with openings for windows and doors. While available for use by those outside NIST, this apparatus must be operated by NIST staff.

Contact:

A. Hunter Fanney

(301) 975-5864

email: hunter.fanney@nist.gov B320 Building Research Building

LINE HEAT-SOURCE

GUARDED HOT PLATE

The 1 m guarded hot-plate apparatus measures thermal conductivity of building insulation materials. The thermal resistance of all insulation products sold in the United States

is traceable to this apparatus. This facility is the only one of its kind in the world that will permit low-density thick insulation to be measured with an uncertainty of less than

0.5 percent.

CAPABILITIES This apparatus has a test temperature range

of 80 °C for the hot plate and -20 °C for the cold plates. The apparatus permits measure- ment of vertical and horizontal heat flow to simulate heat transfer through ceilings and

walls, respectively. This apparatus operates within its own carefully controlled temperature and humidity environment shielded by an insulated enclosure. This facility provides

for absolute measurement of thermal resis- tance of thick and low-density test speci- mens used as transfer standards. These

standards are used to calibrate or verify heat flowmeter (ASTM C518) or guarded hotplate (ASTM CI 77) equipment.
BUILDING AND FIRE RESEARCH LABORATORY

APPLICATIONS NIST researchers use the hot plate to provide

calibration specimens for guarded hot plates

in other laboratories. The hot plate also is used to investigate edge heat loss from thick thermal insulation materials.

AVAILABILITY This apparatus is available for use by those

outside NIST, but it must be operated by NIST staff. Collaborative programs may be

arranged.

Contact:

A. Hunter Fanney

(301) 975-5864

email: hunter.fanney@nist.gov

B320 Building Research Building

ADVANCED INSULATION

FACILITY

The advanced insulation facility consists of experimental apparatus and analytical tools

to assess the thermal performance of advanced insulation systems. These systems

include gas-filled, powder-filled, and metalclad vacuum panels. The facility consists of a calorimeter facility to measure the ther- mal resistance of advanced insulation panels, a state-of-the-art infrared thermography

system to characterize thermal anomalies, and finite element software.

CAPABILITIES The maximum panel size that can be accommodated by the calorimeter facility is

0.9 m x 0.9 m. The maximum thickness

that can be accommodated is 0.1 m. The

temperature of one side of the panel may be

varied from -15 °C to 10 °C. The other side

of the panel, encased by a calorimeter, is maintained at laboratory ambient temperature. The infrared thermography system

consists of both short-wave and long-wave

scanners and advanced software that per- mits analysis of both real-time and stored images. The finite element software is appli- cable to all classes of advanced insulation

systems.

APPLICATIONS The facility is used to measure the thermal

resistance of advanced insulation systems

including, but not limited to, gas-filled, metal-clad vacuum, and powder-filled

panels. The facility is well suited to measure non-homogeneous insulation systems but could be utilized to measure the thermal performance of conventional insulation

materials.

AVAILABILITY This facility has substantial potential for developers of advanced insulation systems in industry and academia. Cooperative

research and development agreements are used to establish research projects within

this facility.

Contact:

A. Hunter Fanney

(301) 975-5864

email: hunter.fanney@nist.gov B320 Building Research Building
CHEMICAL SCIENCE AND

TECHNOLOGY LABORATORY

The Chemical Science and Technology

Laboratory (CSTL) performs cutting-edge

research in measurement science; devel- ops and maintains measurement methods, standards, and reference data; and

develops models for chemical, biochemical, and physical properties and processes. CSTL provides these capabilities to en- hance U.S. industry's productivity and

competitiveness; ensure equity in trade; and improve public health, safety, and

environmental quality.

The technologies and services provided by CSTL help the U.S. chemical manufacturing, energy, healthcare, biotechnology,

food-processing, and materials-processing

industries to meet the broad range of international measurement requirements

and compete in global markets.

One of CSTL's goals is to anticipate the measurement needs of new technologies

so that a measurement infrastructure is available by the time a new technology is implemented. Needs are expanding for accurate, quantitative measurements at ever- decreasing detection limits, in harsher environments, and for a wider range of chemical species.

In addition, the development of novel and

improved processing techniques and new

approaches to pollution prevention and

control are critical to the economic success of U.S. industry. Through a strong commitment to basic research, and by

leading the advancement of measurement

science in critical areas, CSTL is poised to meet emerging national needs.

j Contact: Hratch 6. Semerjian, Director (301) 975-3145

email: hratch.semerjian@nist.gov

fax: (301) 975-3845 A317 Chemistry Building

www.cstl.nist.gov

COOPERATIVE RESEARCH

OPPORTUNITIES

Biotechnology

52 DNA Chemistry

52 Nuclear Magnetic Resonance

52 Bioprocess Engineering Measurements

53 Biomolecular Materials

53 Center for Advanced Research in Biotechnology

Process Measurements

54 Flow Measurement Research and

Standards 54 Measurement Technology for Benchmark

Spray Combustion Data

55 Engineering Measurements for Near- and

Super-Critical Processes

55 Vapor-Phase Synthesis of Nanostructures

55 Chemistry of Materials Processing 56 Flow and Chemistry in Thermal Reactors

56 Plasma Processing of Semiconductors

56 Applied Computational Chemistry

57 Reacting Flow Simulation

57 Solid-State Chemical Microsensors

58 Self-Assembled Monolayers

58 High-Temperature Thermocouples

59 Pressure, Vacuum, and Low-Flow

Standards

59 Quantitative Optical Measurements of

Partial Pressures and Moisture

60 Standards for Raman Spectroscopy

Surface and Microanalysis Science

60 Microbeam Analysis

61 Atmospheric and Chemometric Research

61 Surface Dynamical Processes

Physical and Chemical Properties

62 Fundamental Properties of Trace Components of Natural Gas

62 Fundamental and Applied Properties of Adsorbents

62 Thermophysical Properties of Supercritical Fluid Mixtures

63 Fundamental Properties for Membrane

Separations

63 Thermophysical Properties of Gases

63 Thermophysical Properties of Semiconductor Processing Gases

64 Chemical Thermodynamics

64 Chemical Kinetics

64 Computational Chemistry

65 Pressure-Dependent Chemical Reactions

65 Information for Modern Chemists

66 NIST/EPA/NIH Mass Spectral Database

66 Properties of Alternative Refrigerants

66 Thermophysical Properties of Natural Gas Systems

67 Properties of Fluids and Fluid Mixtures

67 Properties of Gels, Micelles, and Clays

68 Dilute-Solution Thermodynamics

68 Finite-Element Modeling of Complex

Physical and Chemical Processes

68 Advanced Low-Temperature Refrigeration

Analytical Chemistry

69 Inorganic and Elemental Isotopic Metrology

69 Fundamental Studies of Atomic

Spectroscopy

70 Accuracy of Spectrochemical Analysis

70 Analytical Mass Spectrometry for Organics and Biomolecules

70 Chromatography and Electromigration

Techniques

71 Novel Analytical Separation Science Methodology

71 Separation Science Techniques for Trace Organic Analysis

72 High-Accuracy Coulometry

72 Inorganic Electroanalytical Chemistry

72 Trace-Gas Analysis

72 Optical Techniques for Trace-Gas

Analysis

72 Spectroscopy Standards and Process

Analysis

73 Laboratory Automation Technology and

Standards

73 Automated Sample Preparation and

Sensing

73 Analytical Infometrics

74 Chemical Analysis with Neutron Beams

74 Neutron Activation Analysis

74 Focusing of Cold Neutrons for Analytical Measurements

RESEARCH FACILITIES

75 Fluid Flow Measurement and Research

Facilities

75 Liquid-Nitrogen Flow Measurements
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

COOPERATIVE RESEARCH

OPPORTUNITIES

BIOTECHNOLOGY

Division Contact: Gary L. Gilliland (301) 975-2629

email: ga17.gilliland@nist.gov

fax: (301) 330-3447 A345 Chemistry Building

http://indigol5.carb.nist.gov/biotech/ biotech.html

DNA CHEMISTRY

Working in several areas of DNA chemistry, NIST scientists are actively manipulating

DNA to produce proteins, developing methods for measuring DNA damage at the molecular level, and developing methods for characterizing DNA, including mutation

detection and human identity profiling.

NIST scientists are developing experimental

methods to measure DNA damage in mammalian cells exposed to free radicals, generated by ionizing radiation, elevated oxygen

pressure, redox-cycling drugs, or carcino- genic compounds. Free radicals produced

in vivo are thought to be mutagenic and car- cinogenic. Measurement of DNA damage at

the molecular level in mammalian cells is a

prerequisite to understanding the chemical mechanisms of damage by free radicals. Techniques used for measuring DNA damage include gas chromatography, mass

spectrometry, high-performance liquid chro- matography, and nuclear magnetic reso- nance spectroscopy.

NIST scientists are working on new methods

for DNA profiling, ranging from developing

well-characterized DNA standards for restriction fragment length polymorphisms to per- forming research for rapid determination of DNA profiles by polymerase chain reaction amplification and automated detection of

fragments. In addition, NIST researchers are

interested in cooperative development of short-tandem repeat technology, mitochondrial DNA sequencing, and attendant standards. Techniques for DNA detection include

sensitive staining of electrophoretic gels, use

of chemiluminescence, and enhanced appli- cations of capillary electrophoresis.

NIST is investigating methods and standards

for mutation detection, a burgeoning area of

testing in genetic and clinical laboratories.

At this time, no national standards are avail- able for genetic testing protocols. Work is delineating the characteristics of a set of materials intended for use in the standardization of DNA-based mutation detection systems for diagnostic testing and as research tools for determining parameters

that affect the quality of measurements that

are produced by various assay systems.

Contact: Dennis J. Reeder

(301) 975-3128

email: dennis.reeder@nist.gov A353 Chemistry Building

NUCLEAR MAGNETIC

RESONANCE

Detailed knowledge of the structures and

dynamics of macromolecules is critical for a complete understanding of biochemical

reaction mechanisms and molecular recognition processes. Such an understanding can impact bioengineering efforts in the areas of biomaterials, "designer" enzymes, and pharmaceuticals. Programs are under way in which NIST scientists are developing measurement methods, models, and data- bases needed to study macromolecular structure and dynamics using nuclear magnetic

resonance (NMR) spectroscopy. NIST and

the Center for Advanced Research in Biotech- nology maintain a state-of-the-art NMR

facility, which includes superconducting

magnets operating at 400, 500, and 600 megahertz proton resonance frequency.

Research projects include investigations into

the structure and dynamics of carbohydrates, glycoproteins, redox proteins, DNA

enzyme-ligand complexes, RNA and DNA

oligonucleotides, nucleic acid binding proteins, nucleic acid-protein complexes, and

signal transduction proteins. Studies that

utilize NMR measurements to study protein

folding are also under way.

Contacts: John P. Marino

(301) 738-6160

email: john.marino@nist.gov 9600 Gudelsky Drive

Rockville, Md. 20850

Bruce Coxon

(301) 975-3135

email: bruce.coxon@nist.gov A353 Chemistry Building

BI0PR0CESS

ENGINEERING

MEASUREMENTS

NIST scientists are focused on the develop- ment of measurement methods, databases, and generic technologies related to the use

of biomolecules and biomaterials in manufacturing. Measurement methods and data have been developed in the protein spectro- electrochemistry area that will lead to improved understanding of intra- and interprotein electron transfer processes. This understanding helps industrial biocatalyst

development by allowing for more efficient

utilization of carbon sources (e.g., renewable resources) and nutrients, and in devel- oping new ways to drive organic syntheses such as the stereospecific hydroxylation of pharmaceutical precursors. In the biother- modynamics of enzyme-catalyzed reaction

project, chromatography and microcalorimetry measurements have been combined with chemical equilibrium analysis to develop thermodynamic data for several

industrially important biotransformations.
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

The metabolic pathway by which micro- organisms and plants convert glucose to aromatic amino acids is a current focus of

the biothermodynamic measurements. This chorismate metabolic pathway is under current investigation by several large chemical companies as an environmentally friendly source of aromatic hydrocarbons.

In the preparative bioseparations project, electrochromatographic/electrophoretic

separation equipment and methodology are being applied to the separation of different

physical forms of DNA (supercoiled plasmid.

relaxed circular plasmid, and linear genomic). Large-scale purification of these materials is an emerging need in industries developing gene therapies and diagnostic

materials. New biocatalytic systems projects

in enzyme characterization by nitrogen- 15 NMR spectroscopy, X-ray diffraction of protein crystals, and computational chemistry have been initiated. These techniques will be used to address focused, industrially

important biotransformation problems such

as those found in hydroxylation and

aromatic amino acid metabolic pathways.

Contact:

Vincent L. Vilker

(301) 975-5066

email: vincent.vilker@nist.gov A353 Chemistry Building

BIOMOLECULAR

MATERIALS

A current trend in materials development is

to employ biological molecules, principles

that are inspired by biology, or both. Such

materials are sometimes referred to as "biomimetic," indicating they have characteristics such as self assembly, molecular rec- ognition, specific chemical responses, and

complex molecular architecture, which lead

to unique structural or functional characteristics or both. Chemically controlled biomimetic surfaces are essential components of biosensors, bioelectronics, biocatalytic systems, and many diagnostic devices. Biomolecular materials thus influence

diverse applications such as healthcare, environmental pollution monitoring, agriculture, and chemical manufacturing. An

underlying need for these applications of biotechnology is the characterization and

control of biomolecules at interfaces.

Fundamental studies are being conducted to

better understand the structure and function

of natural and biomimetic materials that

self assemble. Lipid membranes are one

such class of self-assembling materials. They organize and control the structure of proteins that naturally reside within them,

many of which have commercially important functions. Project staff members also study models of cell membranes as tools for achieving better quantification of therapeutic agents, which are likely to act at the level

of the cell membrane via cell surface receptors or which have to pass through the cell membrane to be effective.

Interactions among biological molecules and between biological molecules and surfaces occur during sensor operation, diagnostic tests, cellular recognition events and

mobility, and in the formation of modified

surfaces as organized biomolecular materials. In some of these applications, it is

desirable to enhance strong molecular specific interactions while minimizing weaker

non-specific interactions. In other cases, many simultaneous weak interactions are needed to effect the appropriate dynamic

response. NIST develops both the experimental tools, such as chemically controlled

surfaces and techniques for monitoring

reactions at surfaces, and the theoretical

tools to improve understanding of dynamic

biomolecular processes and permit predictions and optimization of reactions of bio- molecules. Methods for kinetic analysis, current noise analysis, and stochastic models of processes at surfaces are under devel- opment in the biomolecular materials group

Macromolecules including bacteriorhodopsin, DNA, and enzymes are examined in vari- ous configurations as potential components

of electrochemical, electronic, and optical

devices. This effort is closely coupled with

the more fundamental studies within the group, with the intention of bringing the knowledge gained from basic science studies

closer to potential applications such as environmental sensing or optical storage. Engineering prototype devices allows consideration of real world issues such as fabrication and adaptation of instrumentation and

methodology to field conditions.

Contact: Anne Plant

(301) 975-3124

email: anne.plant@nist.gov A353 Chemistry Building

CENTER FOR ADVANCED

RESEARCH IN

BIOTECHNOLOGY

At the Center for Advanced Research in Biotechnology (CARB) in Rockville, Md.,

jointly established by NIST, the University of Maryland, and Montgomery County, Md.,

researchers study structure and function

relationships of biological macromolecules. They are focusing on the measurement of

structure by X-ray crystallography and

nuclear magnetic resonance spectroscopy (NMR) as well as the manipulation of structure by molecular biological techniques,

including site-directed mutagenesis. Scientists use modeling, molecular dynamics, and computational chemistry to understand

protein structure and to predict the effects of

specific structural modifications on the properties of proteins and enzymes. A variety of physical chemistry methods are used to measure and analyze structural changes,

activities, and thermodynamic behavior of

biological macromolecules. CARB maintains state-of-the-art facilities for X-ray

crystallography, NMR spectroscopy, molecular biology, and physical biochemistry. Its computer facilities include a variety of
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

computational and high-resolution graphics workstations as well as access to the NIST

supercomputer resources.

Contacts: Roberto J. Poljak

(301) 738-6232

email: roberto.poljak@nist.gov

Edward Eisenstein (301) 738-6272

email: edward.eisenstein@nist.gov

9600 Gudelsky Drive

Rockville, Md. 20850

PROCESS

MEASUREMENTS

Division Contact: Gregory J. Rosasco

(301) 975-2609

email: gregory.rosasco@nist.gov

fax: (301) 869-5924 B3 12 Physics Building

www.cstl.nist.gov/div836

FLOW MEASUREMENT

RESEARCH AND

STANDARDS

The accelerating costs of scarce fluid resources and valuable fluid products—particularly petrochemical fluids—are causing

increased concerns about the performance

of flow meters. Additionally, the role of flow meters in controlling and optimizing critical industrial processes is pushing perform- ance limits and extending the required fluid and flow conditions. To attain these goals, improved flow traceability to NIST standards

is essential.

Improved flow measurement traceability needs to be established and maintained so

that realistic, quantified data are generated on a continuing basis to ensure practical

fluid measurements at satisfactory performance. To achieve the desired flow measure- ment traceability, NIST is conducting

several flow measurement proficiency test- ing programs for a range of fluid and flow

conditions. NIST also is designing new transfer standards to link the performance of cali- bration facilities having special conditions and capabilities to appropriate national ref- erence standards.

Because of the importance of critical flow measurements, transfer standards need to be designed and used so that high levels of confidence can be placed in the measurements

from critical flow meters. New transfer standards are evaluated rigorously against NIST

fluid flow calibration standards. As part of these evaluations, the appropriate range of calibrations will be done on the developed

standards so performance can be ensured at

specified levels. Current fluid metering

research programs use computational fluid dynamics (CFD) with validation using laser Doppler velocimetry (LDV) techniques to focus on flows that are critical to U.S. industry. Currently, the two areas of metering

research are the assessment of acoustic tech- nology for making improved flow measure- ments and the description of flow meter

installation effects. CFD and LDV are applied

in both of these areas.

Contact: George E. Mattingly

(301) 975-5939

email: george.mattingly@nist.gov

105 Fluid Mechanics Building

MEASUREMENT

TECHNOLOGY FOR

BENCHMARK SPRAY

COMBUSTION DATA

Control of process efficiency and the formation of species byproducts from industrial thermal oxidation systems (e.g., power generation and treatment of process liquid chemical wastes) generally are based on a

priori knowledge of the input stream global

physical and chemical properties, desired stoichiometric conditions, and monitoring

of a few major chemical species in the

exhaust. Optimization of the performance of these systems is relying increasingly on

computational models and simulations that help provide relevant process information in a cost-effective manner. In general, there is a dearth of reliable data for specifying

model initial/boundary conditions and a need for experimental/numerical comparative analysis of conditions within the reactor. The reactor volume is precisely the region that requires a better knowledge base

to enable optimization of the chemical and

thermal processes and control of particulate and gaseous emissions. There is a need to provide in-situ, real-time data on the characteristics of the droplet field and flame structure and its interrelationship with the system operating conditions (e.g., desired stoichiometry), heat transfer, and particulate/gaseous byproducts. These data are crucial for the development and calibration of advanced computational models, diagnostics, and instrumentation and the efficient operation of high-temperature process

systems.

Experiments are being carried out in a spray combustion test bed, with a movable-vane

swirl burner enclosed in a refractory chamber. The well-characterized and controlled

facility has evolved to handle different process liquid fuels and wastes, atomizer

designs, and combustor configurations. A

unique array of intrusive probes, nonintrusive diagnostics, and flow visualization techniques are being employed to obtain comprehensive data on spray combustion

characteristics. Current research involves measurement of the input fuel stream (fuel composition), spray flame (droplet size,

velocity, number density, and temperature), and combustor exhaust (particulate size and volume fraction and toxic gas concentrations). NIST researchers are developing

the measurement technology to provide

benchmark experimental data that completely characterize the facility for input/validation/calibration of multiphase

combustion models, calibration of instru- ment/sensors, and development of advanced
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY 55

diagnostics. These databases will be used to

establish correlations between operating conditions and the resultant spray flame characteristics, thermal gradients, and level of chemical byproducts in combustion systems.

Contact:

Car)' Presser

(301) 975-2612

email: cary.presser@nist.gov B312 Physics Building

ENGINEERING

MEASUREMENTS FOR

NEAR- AND SUPERCRITICAL PROCESSES

A variety of promising new chemical tech- nologies takes advantage of the unique properties of near- and super-critical fluids. For example, supercritical water oxidation can

destroy hazardous materials mixed in a water stream, producing benign endproducts in a self-contained process. Devel- opment of robust designs is hampered by an

inadequate understanding of crucial processes in the near- and super-critical fluids, such as reaction chemistry, heat transfer,

fluid mechanics, and phase separation, as

well as lack of thermodynamic and trans- port data. Investigations have been limited by a lack of in-situ measurements due to the

j high-pressure, high-temperature, and often

I chemically harsh environment. This work

focuses on application of in-situ measure- ment techniques and acquisition of vital process data to model and understand these

processes.

Several of these important issues are being

addressed by NIST researchers with a complete range of unique experimental facilities and diagnostic capabilities. Experiments

utilize unique optical cells that provide

access for in-situ measurements of temperature, pressure, density, chemical species and

concentrations, and phase discrimination.

Corrosion detection and characterization is performed with in-situ Raman spectroscopy

for flowing solutions with temperatures up

to 900 kelvin and pressures to 35 megapascals. Precipitation and deposition of "salts"

in sodium sulphate and potassium sulphate

solutions are studied in an optical cell, which can operate at 900 kelvin and 35 megapascals. A bench-scale chemical reactor is used to study ammonia and acetic acid destruction as functions of reactor geometry, temperature, residence time, and

oxidant. Heat transfer experiments are con- ducted in a supercritical carbon dioxide flow

loop, which matches conditions of pilotscale process heat exchangers. Modeling

work is integrated with the experiments; predictions are made of thermodynamic phase

boundaries and other properties of supercritical systems, as well as computations of flow fields, temperatures, and mass transfer. The experimental measurements and models will support process simulation and

design efforts that are currently under way.

Contact: Douglas Olson

(301) 975-2956

email: douglas.olson@nist.gov B3 12 Physics Building

VAPOR-PHASE SYNTHESIS

OF NANOSTRUCTURES

Nanostructured materials have demonstrated novel magnetic, optical, and

mechanical properties. However, practical

application of these materials requires the development of economical synthesis and

processing methods. NIST researchers have

focused their efforts in two important areas. The first is the development of gas-phase

synthesis techniques for bulk production of nanoparticles and nanostructured thin films

(e.g., superconductors, magnetic nanocomposites, metals, and ceramics). This work

includes the use of gas-phase combustion

and thermal flow reactors with emphasis on

the use of in-situ optical diagnostics, such

as planar laser-induced fluorescence and

light scattering, for characterization. Current activities are focusing on the growth of composite particles with enhanced magnetic and structural properties and the production

of nanostructured titanium thin films. Secondly, researchers are studying the application of molecular dynamics and quantum

chemistry methods to describe particle nucleation and growth. Available facilities include excimer, neodymium-yttrium

aluminum garnet, and tunable dye laser

systems; continuous-wave-ion lasers; and

graphics workstations. Expected results from

this work are a better understanding of the mechanisms of particle nucleation and

growth and strategies necessary to obtain

desirable end-products such as commercially important thin films.

Contacts: Michael R. Zachariah

(301) 975-2063

email: michael.zachariah@nist.gov Donald R. Burgess, Jr. (301) 975-2614

email: donald.burgess@nist.gov

B312 Physics Building

CHEMISTRY OF

MATERIALS PROCESSING

This work focuses on both quantitative and

qualitative measurements of the principal

reacting species and the kinetics of the chemistry relevant to thermal chemical

vapor deposition and plasma processing. NIST researchers conduct experiments using

either a high-temperature flow reactor or a

low-pressure plasma coupled to a modulated

molecular-beam mass-spectrometer sampling system. The current focus has been on

the thermal and oxidation chemistry of pre- cursors used in the deposition of SiO'2 films
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

and the chemistry of fluorocarbons relevant

to low-pressure plasma etching processes. Experiments are supported with a strong modeling effort involving extensive use of modern computational chemistry methods

as well as detailed reactor models.

Contacts: Michael R. Zachariah

(301) 975-2063

email: michael.zachariah@nist.gov Donald R. Burgess Jr. (301) 975-2614

email: donald.burgess@nist.gov

B312 Physics Building

control, as well as to increase fundamental

understanding of these important processes.

Contacts: James E. Maslar

(301) 975-4182

email: james.maslar@nist.gov Ronald W. Davis

(301) 975-2739

email: ronald.davis@nist.gov

B312 Physics Building

PLASMA PROCESSING OF

SEMICONDUCTORS

Plasmas are widely used by the semiconductor industry to etch and deposit films. Plasma processing reactors have historically been designed and operated using empirical methods alone, but continued evolution of these tools requires a much greater reliance on process and reactor modeling. Such models would be used as design tools for next- generation processes and equipment. Also, because most existing plasma diagnostic

techniques are incompatible with the manufacturing environment, a need exists to develop sensors for that environment, models to interpret the sensor readings, and new

schemes of closed-loop control based on

these sensors and models.

The goal of this project is to develop advanced chemical and electrical measure- ment methods for characterizing plasmas,

use these measurements to test and develop

models, and apply the models to the develop- ment of new types of sensors and new design

strategies. Measurements of high-density

and low-density plasmas are made in a standard plasma reactor known as the Gase- ous Electronics Conference reference cell.

Also under construction is a new platform,

similar to state-of-the-art industrial reactors designed for 300-millimeter wafers. Measure- ment techniques to probe gas and surface chemistry include optical emission, mass

spectrometry, spectroscopic ellipsometry,

absorption spectroscopy, and planar laser- induced fluorescence (PLIF). PLIF provides

two-dimensional maps of gas phase species

concentrations, enabling investigation of plasma spatial uniformity and rigorous test- ing of plasma simulations. Present PLIF

studies focus on the fluorocarbon plasmas

used for etching and chamber-cleaning.

Electric probe and radio-frequency voltage and current waveform measurements provide electrical characterization of plasma

parameters and reactor conditions. These

electrical measurements, as well as ion energy measurements, are used to characterize and model plasma sheath dynamics. Sheath models developed and verified by

this work have been used to optimize the

efficiency of power utilization in chambercleaning plasmas and to develop a new

technique for measuring the ion current at wafers during high-density plasma

processing.

Contacts: Mark A. Sobolewski

(301) 975-2980

email: mark.sobolewski@nist.gov A303 Physics Building

Kristen L. Steffens (301) 975-2656

email: kristen.steffens@nist.gov B312 Physics Building

APPLIED COMPUTATIONAL

CHEMISTRY

Improvements in process design and control, which can be realized from increasingly sophisticated process models, are not occurring because of the lack of highquality data. New computational chemistry methods offer the potential to revolutionize

the manner in which fundamental thermochemical, physical, and kinetic data are obtained. Research focuses on the develop- ment and application of robust methods for data estimation. NIST scientists are investi- gating the application of empirical correction schemes to ab-initio molecular orbital calculations as a means to obtain high- accuracy data at low computational cost.

FLOW AND CHEMISTRY IN

THERMAL REACTORS

This project is aimed at providing measure- ments suitable for development and testing

of models that may be used as design tools

for development of next-generation process equipment used in the manufacture of microelectronic components. Research

focuses on the characterization of both flow and chemistry in thermal reactors. These

are under investigation using a new optically accessible rotating disk reactor. A major focus of this work is on the detection

of the early stages of contaminant particle formation. Additionally, both chemical

species and thermal fields will be measured

under various operating conditions. This work is in conjunction with a substantial modeling effort in this type of reactor. Available facilities include excimer, neodymiumyttrium aluminum garnet, and tunable dye

laser systems; continuous-wave-ion lasers; mass spectrometers; and high-performance

graphics workstations. The results of this research are expected to aid in the develop- ment of industrial process reactor simulations and on-line diagnostics for process
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

Such methods have been used to predict

the thermochemistry of more than 110 hydrofluorocarbons and oxidized hydrofluorocarbons. These results when compared

to available literature data showed excellent agreement.

Thermochemistry data on the Si-O-H and

Si-P-H system also have been generated for

application to the chemistry of microelectronics processing. A user-friendly reaction

rate theory program has been developed that

will enable the estimation of rate constants. This program, which currently is being

tested, is applicable to any arbitrary reaction manifold and should find wide application

by those interested in large-scale chemistry

simulations. Molecular dynamic simulations are being used to simulate the

structure, properties, and kinetics of clusterto-cluster growth kinetics relevant to nanoparticle formation. These results are finding application in the development

of aerosol models and in improving understanding of nanoparticle growth. Calculations are conducted using the NIST

supercomputer facility and are processed

using high-performance graphic

workstations.

Contacts: Michael R. Zachariah

(301) 975-2063

email: michael.zachariah@nist.gov Donald R. Burgess, Jr. (301) 975-2614

email: donald.burgess@nist.gov

B312 Physics Building

REACTING FLOW

SIMULATION

This research focuses on the chemical process industry's need to understand reacting

systems. The primary emphasis is on sys- tems that involve complex chemistry in such environments as plasma and thermal

processing of microelectronics, combustion, and two-phase flows. Researchers are simulating high-temperature reacting flows to understand the complex coupling between

the fluid flow, heat release, multiple phases,

and chemical reactions. Most recently, simulation of contaminant particle nucleation and growth in materials processing reactors

in support of ongoing experimental efforts have been stressed.

Scientists are developing large, detailed chemical kinetic mechanisms relevant to combustion and plasma etching as well as materials processing chemistries. In addition, researchers are pursuing automated methods for mechanism generation, analysis, and reduction, which rely heavily on

interactive graphics. These approaches

increasingly rely on the use of advanced methods for thermochemical and kinetic data estimation. Calculations are conducted

using the NIST supercomputer facility and

are processed using high-performance

graphic workstations.

Contacts: Ronald W. Davis

(301) 975-2739

email: ronald.davis@nist.gov Michael R. Zachariah

(301) 975- 2063

email: michael.zachariah@nist.gov

B3 12 Physics Building

SOLID-STATE CHEMICAL

MICROSENSORS

The increasing demand for reliable chemical sensors is being driven by wide-ranging measurement needs. The chemical process

industry, for example, now faces new

demands for more efficient use of materials,

better process reproducibility, and environ- mental safety. Similar concerns are encountered in the automotive field, where

researchers are challenged to optimize

engine performance while reducing emissions. To address such measurement needs,

this program concentrates on developing

generic sensor platforms, as well as fabrication and operational techniques, that allow

sensors to be tuned (with active materials and temperature control) for detecting dif- fering target gases and vapors within varied environments.

Fundamental work on sensing materials is done to create the understanding necessary

to optimize performance characteristics such as sensitivity, selectivity, speed, and

stability. Microsensors are based on a "microhotplate" design developed and

patented at NIST. These Si-based, surface- micromachined devices, which have nominal lateral dimensions of between 30 micrometers and 200 micrometers and

masses of approximately 0.25 microgram,

provide microplatforms with localized, measurable, and rapidly variable thermal control. The microhotplate structure can be

repeated easily to form integrated arrays of multiple, individually addressable, and

thermally isolated elements. Rapid heating

(to 500 degrees Celsius and higher) and

cooling characteristics of the devices allow dynamic temperature programming to be
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

used in producing response signatures for

identifying detected species. In this work, neural network methods are employed with

response training sets to develop heating

schedules for high information content operation and recognition. Localized heat- ing of the devices has been combined with chemical vapor deposition to directly define

different active films on array elements. To

date, most efforts have been connected to conductometric gas sensing with semiconducting oxide films (Sn02, ZnO, and Ti02)

that have been modified with catalytic metal

additives (Pt and Pd). However, modified

versions of the microhotplate are being

developed for sensing by calorimetric, capacitance, and other transduction principles. NIST researchers now are examining

the use of organic films, epitaxial films, and

high-area metal dispersions for incorporation into the microsensor platforms. Ther- mally controlled array structures also are being used in efficient studies on materials

suites for new applications.

There is continuing interest in cooperative

research that would assist this interdiscipli- nary program in its efforts to understand and advance sensing mechanisms, sensor

materials, and sensing platforms. Dedicated

facilities for multitechnique surface analysis, device design and micromachining, and response testing can be utilized for investigating new concepts and prototype

structures, and for evaluating sensor per- formance in specific application sectors. NIST researchers also have a growing interest in algorithm development for signal

processing.

Contacts: Stephen Semancik

(301) 975-2606

email: stephen.semancik@nist.gov

Richard E. Cavicchi

(301) 975-3970

email: richard.cavicchi@nist.gov

A303 Physics Building

SELF-ASSEMBLED

MONOLAYERS

Future sensors and diagnostics are being

developed to perform multianalyte measure- ments rapidly, accurately, and at low cost. A

promising approach is to use large-scale solid-phase arrays of molecular recognition elements. One such example is DNA microchip technology, which has the potential for revolutionizing genetic diagnostic and

analysis applications including disease

detection, toxicology, forensics, industrial processing, and environmental monitoring.

Although considerable effort is focused on

applications of DNA and peptide arrays, relatively little research is directed toward understanding the molecular-scale structure and

mechanisms that govern the surface reactions of these monolayer systems. To investigate many of these issues, NIST researchers

are studying alkanethiol self-assembled monolayers (SAMs) formed on gold substrates as a model system. SAMs are robust, reproducibly prepared structures with highly tunable surface properties useful in sensing

applications. Fully functional biomolecular

films are readily prepared by derivatizing a

biological molecule (protein or nucleic

acid) of interest with a thiol group and then

self-assembling the modified biomolecule on gold.

Current studies are focused on determining

the structure/function properties of thiolderivatized, single-stranded (ss) DNA monolayers on gold and their associated hybridization reactions. DNA monolayer

films are prepared with high hybridization

activities and precisely controlled probe cov- erages using a two-component film of thiol- derivatized ssDNA and a passivating thiol to

limit non-specific adsorption of test DNA.

Optical, electrochemical, and neutron meas- urement methods are being developed and

applied to these monolayers for in situ deter- mination of surface DNA density, hybridization activity, and molecular orientation. The

goal of these studies is to ascertain the opti- mal film structure and composition for

promoting hybridization of surface-bound

probes. In addition, scanning tunneling

microscopy is being used to elucidate the molecular packing of the alkanethiol monolayers. The goal of this work is to correlate the nanometer-scale structure of the SAMs

with the macroscopic chemical and physical

properties important in sensing and diagnostic applications.

Contacts: Michael J. Tarlov

(301) 975-2058

email: michael.tarlov@nist.gov

Tonya M. Heme

(301) 975-5153

email: tonya.herne@nist.gov

A303 Physics Building

HIGH-TEMPERATURE

THERMOCOUPLES

Industrial high-temperature processes and

scientific research at high temperatures

require stable thermometers that cover wider temperature ranges with better accuracy than previously required. Problems with thermocouples at high temperatures result primarily from unstable compositions

(impurities, defects, and chemical reactions), causing their electromotive force, and thus their temperature indication, to

drift with use and rapidly become highly

uncertain. A second problem in process measurements is the unreliable measure- ment of surface temperatures resulting from the use of traditional contact and noncontact (radiation) thermometers. Accurate, high-speed measurements of temperatures

of surfaces are especially critical in semiconductor wafer preparation by rapid thermal

processing because accurate control of temperature during short high-temperature

exposures is critical to product quality and

device performance.
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

NIST is developing new wire and thin-film thermocouples as reference thermometers

for secondary calibration laboratories and

as high-accuracy, high-stability, hightemperature thermometers for industrial

use, including use in surface-temperature measurements. Scientists are investigating noble metal thermocouples of exceptionally

high purity and generally resistant to oxidation in high-temperature environments. They also are investigating thin-film thermocouples for accurate surface temperature measurements. These devices become a

part of the surface and thereby obviate the

uncertainties associated with conventional

contact thermometers (uncertainty of the

correlation between measured temperature and surface temperature) and with radiation thermometers (uncertainty with respect

to the time-dependent, effective emissivity of

the surface).

Contact:

Billy W. Mangum

(301) 975-4808

email: billy.mangum@nist.gov B128 Physics Building

PRESSURE, VACUUM,

AND LOW-FLOW

STANDARDS

Many industries depend on accurate pressure, vacuum, and low-flow measurements

for research and development and for process and quality control. NIST develops and

maintains pressure and vacuum standards from 200 megapascals to 10" 7 pascal; flow standards are operated from 10"3 mol/s to 10" 1 mol/s. Facilities include five ultrahigh vacuum systems, two low-range flowmeters,

a mid-range flowmeter, high-accuracy mercury and oil manometers, oil and gas piston gauges, apparatuses for measuring gas densities using optical techniques, and the necessary pressure and vacuum control systems. These facilities are used to provide calibration support for industrial, academic, and

government entities and for research in the

areas where these capabilities can be used to

improve the fundamental understanding of physical phenomena.

These measurement capabilities enable

researchers to develop improved measure- ment techniques and equipment and to investigate the performance of vacuum and

pressure equipment, specifically piston gauges, mechanical pressure gauges, momentum transfer gauges, ionization gauges, thermal mass flowmeters, standard

leaks, and residual gas analyzers. In addition, NIST uses this measurement capability

to investigate properties of materials and

physical phenomena of fundamental interest. Among current projects are the develop- ment of an optical adsorption-based standard for measuring low gas densities, development of a high-precision laminar

flowmeter, modeling of primary pressure standards to reduce their uncertainties, development of a low-gas flow acoustic flow- meter, characterization of thermal mass

flowmeters, and characterization and modeling of residual gas analyzers for semiconductor process control. NIST researchers

also are developing molecular drag gauges

that operate in high-vacuum conditions and

precise isotopic reference standards for pure

gases.

Contact:

Stuart A. Tison

(301) 975-2857

email: stuart.tison@nist.gov A55 Metrology Building

QUANTITATIVE OPTICAL

MEASUREMENTS OF

PARTIAL PRESSURES AND

MOISTURE

Low-level gaseous contaminants cause deleterious effects in chemical and materials processing such as semiconductor manufacturing systems. Many commercially available instruments either are not species

specific, are not sufficiently sensitive, or

utilize detection techniques that perturb the chemical composition and, therefore, compromise the measurement of contaminant

composition. This research seeks to develop

quantitative optical measurement tech- niques that have high species selectivity and

sensitivity. This effort strives to produce a new generation of species-specific, partial pressure measurement standards with a particular emphasis on low-density measure- ment of H2O, CO2, CO, 02, Hz, and CH4.

Optical measurement techniques of primary

interest include photon-induced ionization

spectroscopies for partial pressures less than

10" pascal and absorption spectroscopy in the range of 1 kilopascal to 10" pascal.

Initial efforts are emphasizing the use of cavity-ring-down-spectroscopy, an absorption technique for the measurement of H2O,

which should enable quantitative determinations in the range from approximately

1 kilopascal to approximately 10

6 pascals and resonant enhanced multiphoton ionization techniques with CO in the range of

10" pascal to 10" pascal. In addition to providing non-intrusive measurement tech- niques for measuring partial pressure of con- taminant gases, this research may lead to a new generation of humidity measurement

techniques and primary standards for concentrations as low as 1 in 109

.

Contacts:

J. Patrick Looney

(301) 975-4806

email: john.looney@nist.gov A55 Metrology Building

Joseph Hodges

(301) 975-2605

email: joseph.hodges@nist.gov A303 Physics Building
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

STANDARDS FOR RAMAN

SPECTROSCOPY

A new program has been implemented that draws on the expertise and resources in Raman spectroscopy of the Process Measure- ments Division, the Analytical Chemistry

Division, and the Surface and Microanalysis

Science Division of CSTL to respond to the Raman community's request for NIST to provide much-needed practical standards for analytical Raman spectroscopy. It is widely

acknowledged that major advances in analytical Raman instrumentation have virtually revolutionized Raman spectroscopic

measurements, and Raman spectroscopy now is finding its place in the industrial environment for process measurements and

quality control. Unlike in infrared spectros- copy, in Raman spectroscopy the intensity of the analytical signal is not calibrated as part of the measurement. Consequently, relatively few published spectra have been corrected for the typical variations in the instrument response function, and there are no widely available standardized Raman

spectral libraries. The lack of accepted practices, standards, and spectral libraries has been a main obstacle to the acceptance of Raman in industrial settings and is a barrier

to its use in the regulated industries.

The new research undertaken here is concerned with critically evaluating presently

existing approaches to the standardization

of Raman measurements and aims to develop new methods and techniques so that calibration of Raman spectrometers can be

reliably accomplished for both the signal

intensity and for the Raman shift frequency. One approach will consist of the evaluation

of the laser-excited fluorescence spectra of

rare-earth doped glasses to provide broad- band and narrow-band emissions over the common Raman spectral domains. These

results will lead to the certification of a set of Standard Reference Materials traceable to NIST primary radiometric standards. While

fluorescence can be exploited for intensity calibration, a more fundamental approach

will rest upon the determination of absolute Raman cross-sections, which can provide an

absolute intensity calibration that is verifi- ably instrument independent. Work is planned to develop a Raman gain spectrometer for the measurement of the Raman cross- sections of judiciously chosen liquids and

solids that may serve as absolute Raman

intensity standards. One thrust of the pro- gram is the close coordination of this standards work with the objectives of various organizations outside of NIST including the ASTM Committee for Raman Spectroscopy, which has adopted a set of Raman standards

initiatives. Close contacts are maintained

with the Raman community of major chemical industries and several regulatory agencies. These liaisons are intended to provide

opportunities for collaborative work through

appropriate cooperative agreements.

Contacts: Wilbur S. Hurst

(301) 975-4814

email: wilbur.hurst@nist.gov B312 Physics Building

Steven J. Choquette

(301) 975-3096

email: steven.choquette@nist.gov A213 Chemistry Building

SURFACE AND

MICROANALYSIS

SCIENCE

Division Contact: Ranee A. Velapoldi (301) 975-3917

email: rance.velapoldi@nist.gov

fax: (301) 216-1134 B364 Chemistry Building

www-sims.nist.gov/Division/837home.html

MICROBEAM ANALYSIS

The macroscopic properties and behavior of a wide variety of physical, biological, and

technological phenomena are controlled by chemical events that occur on the microscale. Microbeam analysis techniques based on beams of electrons, ions, and photons can achieve lateral and depth resolution ranging from the micrometer to the nanometer scale, which is equivalent to a sample mass of picograms down to zepto- grams. NIST performs research in many

aspects of the measurement science of microbeam analysis. This research develops

standards, data, and standard methods to meet the critical need for chemical measure- ments that can provide quantitative information on small variations in composition or

structure. The role of trace constituents dis- tributed in microstructures (often at levels

of 1 part in 10

6 to 1 part in 109

) in controlling, for example, device properties is studied through techniques that can achieve

trace nanoanalysis, which combines trace

fractional sensitivity with nanometer-scale

resolution. Measurement of the atoms

(elements) present in a microstructure is complemented by techniques that determine

the molecular (chemical) forms present, as well as the arrangement of atoms and molecules into crystallographic forms.
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY 51

The need to visualize lateral compositional

distributions quantitatively has been the subject of an extensive effort to develop compositional mapping, in which the result is in

the form of an image where the gray or

color level is directly related to numerical

concentration. Initially developed for

picture elements (pixels) in two lateral dimensions, current efforts seek to extend

compositional mapping to three- dimensional volume elements (voxels), a

capability needed to meet the challenges

posed by advanced technologies such as giga-scale electronics and microelec- tromechanical systems (MEMS).

Instrument resources available in the NIST

microanalysis research and analytical

microscopy groups include scanning elec- tron microscopes (conventional, electron probe X-ray microanalysis, environmental, and field emission), high-voltage transmission analytical electron microscopes (conventional and field emission, with X-ray and

electron energy loss analytical spectrometries), an electron-optical/X-ray optical bench, and secondary ion mass spectrometers (ion microprobe, ion microscope, and

laser microprobe with magnetic sector or

time-of-flight mass spectrometers). Also

available are conventional and Fourier- transform Raman optical microprobes;

Fourier-transform infrared microscopy;

X-ray diffraction, including capillary optic

, X-ray microfocusing facilities from conventional X-ray tube and high-brightness rotat- ing anode X-ray sources; and extensive

facilities for computer-aided microscopy and analysis, sample synthesis, and sample

preparation.

j Contacts: David S. Simons

(301) 975-3903

email: david.simons@nist.gov

Eric B. Steel (301) 975-3902

email: eric.steel@nist.gov

A113 Chemistry Building

ATMOSPHERIC AND

CHEMOMETRIC RESEARCH

Concern is mounting worldwide over envi- ronmental contamination and wastes, atmospheric pollution, and potential effects on health and climate. It is imperative to determine with a high degree of accuracy

the individual sources of pollutant species. State-of-the art research, pioneered at NIST, makes possible unique source identification by application of the most advanced micro- chemical and isotopic analytical techniques,

including accelerator mass spectrometry and high-precision gas isotope ratio mass

spectrometry. The data obtained provide

city, state, and national governments with a unique opportunity to develop and test control strategies to reduce emissions of the

identified pollutant sources.

Complementing advanced isotopic-chemical

characterization of atmospheric gases and

particles is basic research in chemometrics,

which represents the synthesis of chemical knowledge and measurement with modern

statistical and computational methods. Work in this area is directed toward improving the quality of chemical measurements

generally through advanced design, meas- urement and data analysis quality assurance, and graphical multivariate data

exploration.

Contacts:

R. Michael Verkouteren

(301) 975-3933

email: michael.verkouteren@nist.gov

Lloyd A. Currie (301) 975-3919

email: lloyd.currie@nist.gov

B364 Chemistry Building

SURFACE DYNAMICAL

PROCESSES

Understanding the processes that occur at surfaces and interfaces, such as the interactions of adsorbates with substrates, is critical

for describing and controlling reactions at these locations. This understanding can

lead to new procedures that are fundamental in tailoring surfaces to produce nanoscale structures, decrease wear and

corrosion, or to develop new electronic

devices, catalysts, or layered materials with improved properties. To address these important technological areas, NIST scientists are

utilizing laser radiation, proximal probes, chemical radicals, and charged particles to study the fundamental atomic and molecular processes that are characteristic of a broad spectrum of surfaces and interfaces. These studies provide information on electronic structure, topography, chemical

reactivity, and the mechanisms of energy

transfer. These techniques are applied in experiments with substrates of metals, semiconductors, insulators, and oxides as well as with selected deposited films of polymers,

oxides, and biomimetic systems.

The investigations of these processes have

progressed from large spatial scales using femtosecond laser spectroscopy and other

surface interrogative techniques to spatial

scales on the order of tens of nanometers

with the current development of infrared,

near-field optical spectroscopic techniques. These experimental techniques are complemented by the development of theories that

pull together diverse ideas to provide comprehensive, focused explanations of the

processes, which, in turn, lead to new

experimental designs and research.

Contact: Richard R. Cavanagh

(301) 975-2368

email: richard.cavanagh@nist.gov

B248 Chemistry Building
62 CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

PHYSICAL AND CHEMICAL

PROPERTIES

Division Contacts: Richard F. Kayser

(301) 975-2483

email: richard.kayser@nist.gov

fax: (301) 869-4020

A 1 1 1 Physics Building

William M. Haynes

(303) 497-3247

email: haynes@boulder.nist.gov

fax: (303) 497-5044

Mailcode 838.00

Boulder, Colo. 80303-3328

http://properties.nist.gov

FUNDAMENTAL

PROPERTIES OF TRACE

COMPONENTS OF

NATURAL GAS

Natural gas is a complex mixture that can

consist of between 300 and 400 organic and

inorganic components, many of which are present at relatively low (trace) concentrations. Most of these materials are naturally

occurring, while some are intentionally added during processing. The properties of many of these trace constituents are important since they can strongly affect the overall behavior of the natural gas. NIST

researchers recently have completed measurements on the vapor pressure and the enthalpy of adsorption (on pipeline surfaces) of a family of chlorinated trace constituents. The vapor pressure studies were done on three pieces of equipment that were

specifically constructed for measurements on involatile compounds. The enthalpic measurements were carried out on a modified gas chromatographic apparatus.

Current work is concerned with stand- ardizing the extended analysis of natural

gas through the use of measured chromatographic retention indices. The researchers have constructed dedicated chromatographic instrumentation specifically to provide the accuracy required for these measurements. This will facilitate component identification for custody transfer and

calorific value calculations. They also are measuring the diffusion of odorants (strong- smelling sulfur compounds added to aid in detection) in natural gas. These measure- ments are performed on a Taylor-Aris apparatus that was constructed for high-pressure

fluids. This work will provide a fundamental

understanding of odorant fading, a problem

that often occurs during winter months.

Contact: Thomas J. Bruno

(303) 497-5158

email: bruno@boulder.nist.gov

Mailcode 838.01

Boulder, Colo. 80303-3328

FUNDAMENTAL AND

APPLIED PROPERTIES OF

ADSORBENTS

The industrial consumption of adsorbents

for separation processes is in the range of a megaton per year. These adsorbents include

silicas, aluminas, carbons, and zeolites, and

their uses range from commodity chemical

separations to small-scale environmental

applications. An understanding of the properties of these materials is vital to efficient separation process design and operation. A NIST research program is focused on the measurement and modeling of fundamental

parameters such as the enthalpy of adsorption and adsorption isotherms (which are measures of the attraction of a chemical on

an adsorbent) and the skeletal density (a measure of the ultimate capacity) of adsorbents. NIST has designed and constructed apparatus for these measurements and has

applied them to clay and carbon adsorbents.

The techniques also allow the study of the

effects of surface modifications of adsor- bents that are produced by compounds

such as surfactants. These measurements

are combined with surface observations obtained from neutron scattering and dynamic light scattering to elucidate the surface structure. This will permit design of novel special-purpose adsorbents, since the researchers will have a clear idea of what

components or areas of an adsorbent

structure are important for the separation

process.

Contact: Thomas J. Bruno

(303) 497-5158

email: bruno@boulder.nist.gov

Mailcode 838.01

Boulder, Colo. 80303-3328

THERMOPHYSICAL

PROPERTIES OF

SUPERCRITICAL FLUID

MIXTURES

All facets of chemical process technology

require an accurate knowledge (or reliable

predictive capability) of various thermophysical and chemical properties of pure chemicals and their mixtures. This is especially true of separations because of the

great diversity of chemicals involved, with

widely varying molecular sizes, shapes, and

polarity. In addition to this inherent complexity, industry now is exploring the appli- cation of alternative solvents for separation

processes because many traditional solvents have environmental and health risks associ- ated with their use. This project explores the modeling of processes using alternative solvents through multivariate statistical analysis incorporating a number of empirical and

semi-empirical chemical and thermophysical variables as input.
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

Work is in progress to extend significantly

the Kamlet-Taft solvatochromic chemical

parameters to the alternative solvents in the

subcritical and supercritical phases. Both

chemical and thermophysical variables are incorporated into a multivariate statistical model to better predict solution processes

of industrially relevant compounds in the

alternative solvents. This requires the experi- mental determination of acidity, basicity,

polarity7

, polarizability, and density of potential solvents. These measurements are per- formed spectroscopically. In addition to providing a predictive approach to solvent behavior, this work provides insight into understanding of the solution process itself.

In addition to the spectroscopic-based tech- niques mentioned earlier, a magnetic levitation solubility instrument is being developed

to measure phase equilibria of mixtures not amenable to spectroscopic measurement.

Contact: Thomas J. Bruno

(303) 497-5158

email: bruno@boulder.nist.gov

Mailcode 838.01

Boulder, Colo. 80303-3328

FUNDAMENTAL

PROPERTIES FOR

MEMBRANE SEPARATIONS

Membranes are used increasingly in separation and novel synthesis processes and as components of process sensors. To add to

the science and engineering base of membrane technology, NIST is working on methods of measuring and correlating chemical and morphological structure with gas and

vapor transport-property relationships in both phase-separated polymers and homopolymers. Ionomers, interpenetrating poly- mer networks, and polymer blends are examples of the former. The linchpin of this

effort is obtaining consistent and accurate

measurements of solubility and permeability

for a variety of gases and gas mixtures in novel polymers that can be chemically or morphologically altered in a systematic way. These data then can be used as starting

points for developing molecular-level prediction of transport properties.

Contact: John Pellegrino

(303) 497-3416

email: jjp@boulder.nist.gov Mailcode 838.01

Boulder, Colo. 80303-3328

THERMOPHYSICAL

PROPERTIES OF GASES

Thermophysical properties of gases are required to design heat transfer machinery and chemical processes. NIST obtains very accurate values for these properties (equation of state, heat capacity, thermal conductivity, viscosity, and speed of sound) by

exploiting high-Q acoustic resonators devel- oped and modeled at NIST.

NIST routinely measures the speed of sound

in gases with uncertainties of less than ±0.01 percent. NIST data were used to deter- mine the thermodynamic properties of more

than 20 environmentally benign, candidate replacement refrigerants and of helium- xenon mixtures used in thermoacoustic

refrigerators. To extend these measurements

to corrosive gases and gases at very high

temperatures, NIST developed acoustic wave

guides to conduct sound from remote

transducers into and out of resonators through corrosion-resistant metal dia- phragms. NIST also developed novel acoustic resonators for measuring the viscosity and thermal conductivity of gases with an

imprecision of 0.1 percent.

NIST is using acoustic measurements of the highest possible accuracy to measure the imperfections in the internationally

accepted temperature scale (ITS-90) in the range 200 kelvin to 700 kelvin. For this work, the speed of sound in argon is measured with an imprecision of 0.0001 percent

in a spherical resonator. The thermal expansion of the resonator is measured using

microwaves. To maintain the purity of the argon at 700 kelvin, clean argon continuously flows through the resonator with a pressure that is controlled to 1 part in 10

6

.

Contact: Michael R. Moldover

(301) 975-2459

email: michael.moldover@nist.gov A105 Physics Building

THERMOPHYSICAL

PROPERTIES OF

SEMICONDUCTOR

PROCESSING GASES

Mass flow controllers (MFCs) deliver process

gases for plasma etching, chemical vapor

deposition, and other processes used throughout the semiconductor industry. The

operation of the most widely used kind of MFC depends upon heat transfer through

the process gas; thus, the sensitivity of these MFCs depends upon the thermophysical

properties of the process gas, and each gas

requires a different MFC calibration. However, many process gases are toxic, corrosive, and/or pyrophoric, making it impractical to calibrate directly all MFCs for

all 50 or so process gases.

An alternative to direct calibration is based upon flowing benign "surrogate" gases (such as N2, CF4, SF6, or C2F6) through the MFCs and scaling the MFCs' response to account for the differences between the ther- mophysical properties of the surrogate gas
64 CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

and those of the process gas. The relevant gas properties are density, heat capacity, thermal conductivity, and viscosity. These

should be known throughout the temperature and pressure ranges in which MFCs

operate. NIST is exploiting its expertise in acoustic technologies to measure the ther- mophysical properties of the four process

gases (CI2, HBr, BCI3, and WF6) and the

three surrogate gases (CF4, SF6, and C2F6)

that were identified by the semiconductor

industry as having the highest priority.

Contact: Michael R. Moldover

(301) 975-2459

email: michael.moldover@nist.gov A105 Physics Building

CHEMICAL

THERMODYNAMICS

The Chemical Thermodynamics Data Center

carries out expert evaluations of thermo- dynamic data on organic and inorganic

compounds. In addition to the Joint Army/

Navy/Air Force Tables, current interests include comprehensive evaluations of thermodynamic data related to atmospheric

chemistry, such as the destruction of the

stratospheric ozone layer, and of data for organic compounds important to the chemical and related industries. The latter work

has the long-range goal of producing reli- able estimation schemes for predicting the

properties of species for which measure- ments are not available or would be difficult or impossible to perform. In planning and

executing its programs, NIST maintains

close contact with industrial organizations such as the Design Institute for Physical

Properties Data.

NIST researchers use precision oxygen- bomb and fluorine-bomb calorimeters to determine data on enthalpies of combustion, from which enthalpies of formation

can be derived. The addition of a new low- temperature heat capacity calorimetry

facility now gives the NIST thermodynamics

laboratories the capacity to carry out the full range of measurements necessary to deter- mine chemical equilibrium constants for systems of interest. The focus is on the deter- mination of thermodynamic properties of materials important to modern technologies such as chemical process modeling and

simulation and semiconductor processing,

as well as on the certification of calorimetric Standard Reference Materials.

Contacts: Robert Huie

(301) 975-2559

email: robert.huie@nist.gov A26l Chemistry Building

Gary Mallard

(301) 975-2564

email: gary.mallard@nist.gov Alll Physics Building

CHEMICAL KINETICS

The chemical kinetics program at NIST provides reliable measurement methods, chemical kinetics data, and theoretical models.

Applications of this research include combustion, plasma processing, new chemical and energy-related technologies, environ- mental chemistry, effects of ionizing

radiation on materials, and analytical

applications of kinetics. Among the experi- mental projects under way are high-pressure mass spectrometric studies of the kinetics and thermochemistry of ion/molecule reactions and clustering processes and pulse

radiolysis of aqueous solutions. Researchers

also are studying free-radical kinetics using

heated single-pulse shock tubes and flash- photolysis kinetic-absorption and resonancefluorescence techniques.

At present, there is significant emphasis on

developing and using cavity-ring-down laser absorption spectroscopy to study chemical

kinetics in the gas phase and at surfaces. In addition, this group uses resonance- enhanced multiphoton ionization spectros- copy to provide very sensitive and selective schemes for the optical detection of free

radicals and to acquire new, previously unobtainable data about their electronic

structures. An important focus of the kinetics program is the production of databases

of evaluated chemical data, including

kinetic data and spectral data for analytical

chemistry, as well as the design of databases and relevant software.

Contacts: Robert Huie

(301) 975-2559

email: robert.huie@nist.gov A26l Chemistry Building

Gary Mallard

(301) 975-2564

email: gary.mallard@nist.gov Alll Physics Building

COMPUTATIONAL

CHEMISTRY

The quality and efficiency of chemical processing, including shrinking the timelines for

industrial process scale-up and optimizing

processes to maximize yields and minimize

unwanted wastes and byproducts, can

be greatly enhanced through computer

simulation.

However, reliable simulation of chemical

processes often is inhibited by the lack of accurate chemical and physical property data for individual molecular species, mixtures, and reactions. Industrial scientists and engineers are beginning to look to quan- tum chemistry as a source of timely and

cost-effective estimates of needed property

data. This has generated an intense need for systematic testing, evaluation, and bench- marking of quantum chemistry methods in
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY 55

order to establish the accuracy, reliability,

applicability, and relative merits of different computational tools or approaches for differ- ent problems.

The computational chemistry group is devel- oping databases and computational archives

that will function as a resource for scientists and engineers who want to compare the eco- nomics and accuracy of various computational methods for estimating properties. Current efforts are focused on thermochemical and kinetic properties. State-ofthe-art computational methods are developed, tested, and evaluated. Bench- mark comparisons are made against accurate experimental data for classes of chemical compounds and reactions. Databases of computational and experimental

comparisons are developed in order to provide reliable estimates of the accuracy and

precision of well-defined computational

,' methods.

Long-range interests include the develop- ment of computational methods for predicting reaction mechanisms and reaction rates

in solution; the development of more accurate methods for determining the structures and thermodynamic properties of large molecules; the development of new hybrid

quantum chemistry methods with empirical

corrections for predicting thermochemical

1 properties; the development of robust density

j functional methods that are applicable to

' transition states; and the development and

testing of quantum chemistry methods for molecules containing heavy atoms.

j Contact: Walter J. Stevens

(301) 975-5968

j email: walter.stevens@nist.gov All 1 Physics Building

PRESSURE-DEPENDENT

CHEMICAL REACTIONS

While many chemical reactions proceed at

rates that are independent of pressure, there

is a group of important reactions that have

pressure-dependent rate constants. A number of theories have been used to explain

and predict the rates of these reactions, but none has been successful for some of the most complex reactions. It is often these very complex reactions, with multiple pathways, that are important in understanding

how complex mixtures such as gasoline

react at high temperatures.

Work at NIST has provided a new way to cal- culate these rate constants so that the many

pathways that are observed in these reactions can be predicted. This work is important in the analysis of the experimental data from these complex reactions as well as in providing the fundamental understanding

of how to use modern quantum mechanical

calculations to predict the pressure dependence of these reactions. These calculations have been used to reinterpret older experi- mental data to derive fundamental thermochemical information. More importantly,

the work has led to a better understanding

of the role of highly energetic species formed in recombinations.

The theoretical results are being applied in a number of practical reacting systems. The

destruction of chemical weapons, the decomposition of hydrocarbons in complex mixtures, and the reactions involved in chemical vapor deposition have been studied using these new techniques. In each

case, better and more consistent models

have been created using these new tools.

INFORMATION FOR

MODERN CHEMISTS

The amount of information available in chemistry has grown steadily. The tools needed to access this information have not

evolved as rapidly as the technical community's need to find the larger amounts of

data. NIST has developed a tool to provide

access to the chemical data over the

Internet. Using the conventions of the World Wide Web, the NIST Chemistry WebBook

(http://webbook.nist.gov) is providing a growing audience with thermochemical,

thermophysical, and spectral data for a

large set of substances.

The goal of the WebBook is to provide a single point of access to all NIST chemical

data. The current edition contains data for more than 20,000 molecules. Data from NIST archival collections used in developing

evaluated data, NIST evaluated data, archival data from non-NIST sources, and evaluated data from non-NIST sources are

provided. Every data item is individually

referenced, and cross-references by author, research paper, and other molecules are provided. The WebBook is designed to be easy to

use, even for novice users. For example,

users can search for molecules by name,

molecular formula, and partial molecular

formula, as well as by property values. Data

can be graphed and the resulting graphs

expanded for more detail. This is especially useful for complex spectral data such as infrared spectra.

Contacts:

Peter Linstrom

(301) 975-5422

email: peter.linstrom@nist.gov

Gary Mallard

(301) 975-2564

email: gary.mallard@nist.gov

Contacts: Wing Tsang

(301) 975-2507

email: wing.tsang@nist.gov Al 1 1 Physics Building

Gary Mallard

(301) 975-2564

email: gary.mallard@nist.gov

Al 1 1 Physics Building
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

NIST/EPA/NIH MASS

SPECTRAL DATABASE

One of the most widely used techniques

for identifying organic compounds is gas chromatography/mass spectrometry. In this technique, complex mixtures of chemicals

are separated using gas chromatography, and then each compound is "fingerprinted"

using the mass spectrometer. The resulting

spectra are analyzed and compared to a

library of known spectra. To be successful,

the library of known spectra must have only

high-quality, complete spectra, and the algorithms used to compare the library and

unknown spectra must be robust and well

tested.

NIST programs develop and test algorithms

for matching and predicting, evaluate spectra from other contributors, and fill in missing data with an ongoing experimental

effort. The goal is to develop a mass spectral database containing every compound in commerce. The result of these efforts is an

increasing acceptance of the NIST database and algorithms as the standard. In addition

to the experimental, evaluation, and algo- rithmic development work, NIST promotes

the use of high-quality tools within the mass

spectrometry instrument community.

Contacts: Stephen E. Stein (301) 975-2505

email: stephen.stein@nist.gov

Gary Mallard

(301) 975-2564

email: gary.mallard@nist.gov

Al 1 1 Physics Building

PROPERTIES OF

ALTERNATIVE

REFRIGERANTS

Chlorofluorocarbons (CFCs) and hydro- chlorofluorocarbons (HCFCs) have been

used widely for the past 50 years as refrigerants, as foam-blowing agents, and in many

other applications. Recent evidence has shown, however, that CFCs and, to a lesser

extent, HCFCs, are breaking down the strato- spheric ozone layer that protects the Earth from harmful levels of ultraviolet radiation. These fluids also contribute to greenhouse

warming. Alternative chemicals must be found to replace the existing fluids as quickly as possible. To replace the CFCs

and HCFCs, accurate knowledge of the thermophysical properties of the substitutes

is required.

NIST provides these data to industry. Research includes extensive experimental measurements on pure fluids and mixtures,

including saturation and single-phase densities, vapor pressure, heat capacity, thermal

conductivity, viscosity, sound speed, and surface tension. The program includes a substantial effort in modeling fluid properties

and in developing equations of state. NIST

also leads efforts to arrive at international standards for refrigerant properties.

Contacts: William M. Haynes

(303) 497-3247

email: haynes@boulder.nist.gov Mailcode 838.00 Mark 0. McLinden

(303) 497-3580

email: mark.mclinden@nist.gov

Mailcode 838.07

Boulder, Colo. 80303-3328

THERMOPHYSICAL

PROPERTIES OF NATURAL

GAS SYSTEMS

A comprehensive experimental and modeling research program is focused on the ther- mophysical properties of natural gas systems needed by the gas industry for custodytransfer operations, for energy optimization

in gas industry operations, and for the design and control of gas processes. Major

goals of the program are to develop the means to accurately model and predict the thermodynamic, phase equilibrium, and

transport properties of complex fluid mixtures that contain hydrocarbons to C20+; other constituents such as carbon dioxide,

nitrogen, and hydrogen sulfide; and trace constituents such as water, helium, hydrogen, carbon monoxide, argon, oxygen, and

others. The program is designed to provide

state-of-the-art measurements on selected systems needed to support the modeling

efforts. These models and data cover the ranges of temperature (90 kelvin to 700 kelvin) , pressure (70 megapascals) , and composition (full range) necessary for efficient operation of the gas industry, with emphasis on the major region for custody transfer operations. The models cover all fluid states

(gas, vapor, and liquid), including properties along phase boundaries, and can be used to calculate the properties of natural

gas; liquefied natural gas; natural gas liquids; substitute/synthetic natural gas; compressed natural gas, and wet, dry, and sour

gases.

Research includes extensive experimental measurements on both pure fluids and mixtures, including saturation and single-phase

densities, vapor pressures, heat capacities, sound speeds, thermal conductivities, and

viscosities. Vapor-liquid and solid-fluid
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

phase boundaries also are studied. A substantial modeling effort involves the develop- ment of highly accurate mixture models and pure fluid equations of state. A new generalized mixture model, based on the excess Helmholtz energy and standard reference

quality formulations for the constituents, shows promise to be the most accurate model available for mixture properties. These models are incorporated in computer

databases that serve as the major mechanisms for technology transfer of the data to

industry. NIST also participates in efforts to

arrive at national and international standards for natural gas properties.

Contact: William M. Haynes

(303) 497-3247

email: haynes@boulder.nist.gov Mailcode 838.00

Boulder, Colo. 80303-3328

PROPERTIES OF FLUIDS

AND FLUID MIXTURES

The thermophysical properties of fluids and

fluid mixtures are essential for process design and control in the chemical, natural

gas, aerospace, environmental, and energyrelated industries. The research program in

fluid properties involves experimental and

theoretical research and computer simulation studies on the thermodynamic and

transport properties of pure fluids and fluid mixtures. A primary goal of this program is

to develop highly accurate predictive models

for the thermophysical properties of fluids and fluid mixtures. This is accomplished

through an integrated program of measurement, theory, and correlation. Apparatus are

available for state-of-the-art measurements

of the thermodynamic and transport properties of pure fluids and mixtures, including

pressure-volume-temperature relations, speed of sound, heat capacity, dielectric constant, viscosity, phase equilibria, and ther- mal conductivity over wide ranges of

temperature and pressure. Included in this work are measurements in the critical and

extended critical region. In concert with the experimental work, NIST researchers conduct theoretical studies to develop wide- range predictive models and computer

codes.

A wide variety of research, both experimental and theoretical, is directed toward the understanding of complex fluid behavior,

the microscopic structure of fluids, and the

liquid-solid phase boundary. Included are

studies of non-Newtonian fluids, colloidal suspensions, shear-induced chemical reactions, supercooled fluids and melting phe- nomena, and macromolecules. A unique

shearing cell is available for neutron scatter- ing studies at the NIST Center for Neutron

Research.

Molecular-level computer simulation has

proved an essential technique for utilizing

statistical mechanics-based models of con- densed matter. Molecular dynamics studies, involving both equilibrium and nonequilibrium systems, have been conducted. Computer simulation studies are important

in interpreting and understanding the

results of experimental studies in fluids and

in developing predictive models of fluid

properties. Other theoretical studies include dynamic and static critical region models

(emphasizing mixtures), extended corre- sponding states, equations of state, kinetic

theory of gases and dense fluids, theory of the glassy state, properties of mixtures of dissimilar compounds, phase transitions, and structure-based modeling.

Contacts: Daniel G. Friend

(303) 497-5424

email: friend@boulder.nist.gov Mailcode 838.08 Richard A. Perkins

(303) 497-5499

email: perkins@boulder.nist.gov Mailcode 838.07

Boulder, Colo. 80303-3328

PROPERTIES OF GELS,

MICELLES, AND CLAYS

NIST researchers are using small-angle neutron diffraction, static visible laser-light

scattering, dynamic time-correlation spectroscopy, and computer simulation to study

the structure and properties of systems containing particles with sizes in the range of

10 nanometers to 1000 nanometers. In addition to the fundamental information being

obtained about complex fluids, these suspensions are interesting in their own right. For example, sol/gel technology is being used

increasingly in the production of ultrahighpurity optical glasses. Using neutron diffraction and computer simulation, NIST

scientists are improving understanding of the formation dynamics and structure of the precursor gel (a state of matter intermediate

to liquid and solid). Dynamic light scatter- ing studies, coupled with experiments using neutron scattering, also are being used to

better understand the interaction between

surfactant micelles and clay platelets. This

will improve understanding of how organic

pollutants interact with clay. Current activities include the study of colloidal silica solutions, gelation of silica at high volume

fraction, cationic surfactant micelles, and

adsorption of large organic molecules on

suspended and dispersed clay platelets.
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

Much of this research is directed toward understanding complex fluids. The characteristic time scales governing the dynamics

of colloidal solutions are many orders of magnitude slower than in molecular fluids.

Colloidal solutions thus provide NIST scientists with experimentally accessible models

for the study of complex fluid behavior. Non-Newtonian fluid behavior is being studied using the NIST Couette-flow shearing

cell at the small-angle neutron scattering

beam lines of the NIST Center for Neutron

Research.

Contacts: Howard J. M. Han ley

(303) 497-3320

email: hanley@boulder.nist.gov Mailcode 838.00

Brent D. Butler

(303) 497-3952

email: bbutler@boulder.nist.gov Mailcode 838.08

Boulder, Colo. 80303-3328

DILUTE-SOLUTION

THERMODYNAMICS

Much chemical technology, particularly in

the environmental area, involves solutions where the concentration of the substance of

interest is near zero. The thermodynamics of

these dilute solutions presents special challenges and opportunities. One area of interest is the solubility of substances in liquid

solvents. Water is the most important solvent, but dilute-solution thermodynamics

(usually in the form of Henry's law) is used

in many different applications.

Recently, new theoretical understanding of

the high-temperature behavior of Henry's

constant has been exploited to produce an

improved model for correlating Henry's constants over a wide temperature range and for extrapolation of existing data to higher temperatures. This project works toward using

structural and other data to predict Henry's

constants of organic compounds in water at conditions characteristic of air stripping and

steam stripping operations. Dilute-solution thermodynamics also can be used to analyze

the solubility of solids in vapors and supercritical fluids, which is important for a variety of processes, including extraction using

CO2 and deposition of minerals in steam power plants. Modeling efforts focus on

using the density of the solvent as the key

variable. Molecular computer simulation

is used to test the validity of modeling

approaches.

Contact:

Allan H. Harvey

(303) 497-3555

email: aharvey@boulder.nist.gov Mailcode 838.08

Boulder, Colo. 80303-3328

FINITE-ELEMENT

MODELING OF COMPLEX

PHYSICAL AND CHEMICAL

PROCESSES

This group's objective is to elucidate the physicochemical details of industrial methodologies to provide a basis for improved

processes, to provide quantitative information for selection among processing alternatives, and to uncover limiting factors in current approaches such as uncertainties in

available property data or geometrically caused flow instabilities. The group is using

the finite-element technique to simulate and analyze fluid flow with associated heat

transfer, mass transfer, and chemistry. Two

areas of current modeling research are organometallic vapor-phase epitaxy and

fluid/solid-particle systems.

Contacts: Adele P. Peskin

(303) 497-3466

email: adele@boulder.nist.gov

Gary R. Hardin

(303) 497-5168

email: hardin@boulder.nist.gov

Mailcode 838.08

Boulder, Colo. 80303-3328

ADVANCED

LOW-TEMPERATURE

REFRIGERATION

Many new and developing technologies rely on the use of cryogenic temperatures. Some

of these technologies include the cooling of

infrared sensors for night vision, atmospheric studies, and process monitoring;

semiconducting and superconducting electronics for increased speed and reduced

noise; cryopumps for the production of clean vacuums in semiconductor processing; magnetic-resonance imaging superconducting magnets; some medical catheters; and the liquefaction of natural gas for a clean-burning transportation fuel. Specialized refrigerators known as cryocoolers are required to reach cryogenic temperatures.

Significant research and development of cryocoolers has occurred in the last

15 years to meet the reliability, cost, and

efficiency requirements of many different

applications.

NIST has been a world leader in this advanced refrigeration field and has led the development of a new type of cryocooler, known as the orifice pulse tube refrigerator (OPTR), that is being considered for all of

the applications discussed above. In its nor- mal configuration, it has only one moving

part at room temperature and can reach temperatures below 40 kelvin in a single

stage. Using thermoacoustic drivers in place
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

of mechanical compressors, NIST and Los Alamos National Laboratory scientists devel- oped an OPTR that became the first cryo- genic refrigerator with no moving parts. A

patent, a Strategic Defense Initiative Office innovative technology award, and an R&D

100 award have been received for this

device, called a TADOPTR. NIST has collaborated with dozens of companies and other government laboratories to transfer this and

other new cryocooler technologies into specific application areas. NIST computer models on regenerator performance are used

extensively in the field to aid in the optimization of regenerative cryocoolers.

NIST researchers have done substantial research on many types of cryocoolers to improve their technologies so they may be

useful for various applications. In the area

of Joule-Thomson refrigerators, NIST scientists have performed adsorption isotherm measurements for many different gases on

various carbons. This extensive database is used by government and private laboratories

in the design of adsorption compressors for

cryocoolers.

Contact: Ray Radebaugh

(303) 497-3710

email: radebaugh@boulder.nist.gov

Mailcode 838.09

Boulder, Colo. 80303-3328

ANALYTICAL CHEMISTRY

Division Contact:

Willie E. May

(301) 975-3108

email: willie.may@nist.gov

fax: (301) 926-8671 B158 Chemistry Building

www.cstl.nist.gov/nist839

INORGANIC AND

ELEMENTAL ISOTOPIC

METROLOGY

NIST researchers are improving and applying high-accuracy and precision isotope

ratio measurements for isotope dilution mass spectrometry (IDMS), as well as identifying and tracking species with unique isotopic signatures. Available instruments

inductively coupled plasma (ICP-MS), thermal ionization, and laser resonance

ionization mass spectrometers—have

diverse capabilities. Research programs are

possible in elemental, isotopic, and speciation measurement. Stable and radioisotopes can be applied to study environmental and

health problems, materials, and processes.

Research can be directed to innovative devel- opment of instrumentation and methods,

the characterization and interpretation of unique samples, or the determination of

natural, absolute isotopic abundances.

Researchers are studying chemical separation schemes to eliminate ionization and

isobaric interferences and to increase the speed and reliability of sample introduction. They also are investigating various schemes

for quantitative analysis using ICP-MS for non-IDMS applications.

Contacts: John D. Fassett (301) 975-4109

email: john.fassett@nist.gov A21 Physics Building

Gregory C. Turk

(301) 975-4118

email: gregory.turk@nist.gov B24 Physics Building

FUNDAMENTAL STUDIES

OF ATOMIC

SPECTROSCOPY

The continued development and improve- ment of analytical atomic spectrometry

requires understanding of fundamental

processes that occur in flames and plasmas.

Researchers are investigating sampling,

excitation, emission, and absorption phe- nomena in all types of flames, glow dis- charges, and other plasma sources useful in chemical analysis. Advanced approaches

used in these studies include laser probes and mass spectrometry for enhanced ionization and resonance ionization studies, as well as ultrahigh resolution spectroscopic

investigations using one of the few ultraviolet Fourier transform spectrometer sys- tems in the world. Research opportunities include spectral characterization such as hyperfine structure and isotopic shifts, appli- cation of advanced computational methodologies, and energy transfer mechanism

studies.

Contact: Gregory C. Turk

(301) 975-4118

email: gregory.turk@nist.gov B24 Physics Building
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

ACCURACY OF

SPECTROCHEMICAL

ANALYSIS

Instrumental methods of analysis require

the control of a complex list of parameters

to ensure accuracy. Furthermore, such methods of chemical analysis produce large

quantities of multidimensional data that challenge the analyst's ability to interpret

the results. Using both advanced approaches

in automation to control experimental

parameters and mathematical tools to opti- mize, sort, and summarize complex data

sets, NIST researchers are designing studies

to improve the accuracy of all forms of atomic spectrometry. Research is directed toward developing optimized and automated sample treatments and separation chemistries using microwave-digestion and flowinjection technologies. Automated

approaches for instrument control, drift, and interference corrections also are employed. Multidimensional data generated

by both rapid scanning and array detector spectrometers are analyzed using personal

computers and NIST central computing

facilities.

Contacts: Marc L. Salit (301) 975-3646

email: marc.salit@nist.gov

(ire gory C. Turk

(301) 975-4118

email: gregory.turk@nist.gov

B24 Physics Building

ANALYTICAL MASS

SPECTROMETRY FOR

ORGANICS AND

BIOMOLECULES

Researchers are developing advanced tech- niques in mass spectrometry and applying

them to the detection, identification, and

accurate quantitation of trace levels of organic compounds. Available instrumentation includes a triple quadruple mass spec- trometer with electrospray, cesium ion bombardment, positive- and negative-ion chemical ionization, and electron ionization; a magnetic mass spectrometer with

capabilities for high resolution, fast atom

bombardment, and linked scanning; and a

liquid chromatograph/mass spectrometer

with electrospray and atmospheric pressure chemical ionization.

The group encourages research that is

related to electrospray and other techniques

suitable for coupling liquid chromatography

or capillary electrophoresis to mass spec- trometry, particularly if the work may lead

to developing techniques for the quantitation of polar and non-volatile analytes in complex matrices. Of particular interest are biomolecules that are markers for health

status.

Research in understanding and applying ion

trap technology to quantitative gas chromatography/mass spectrometry/mass spec- trometry also is encouraged as is research

into understanding and applying collision- induced and surface-induced dissociation to

analytical problems.

Contacts: Michael J. Welch

(301) 975-3100

email: michael.welch@nist.gov

Edward White V

(301) 975-3101

email: edward.white@nist.gov

CHROMATOGRAPHY AND

ELECTROMIGRATION

TECHNIQUES

Solute retention in chromatography and

electromigration systems is the result of a complex assortment of molecular interactions between the solute, the stationary

phase, and the mobile phase. The diversity

of these interactions can be utilized to opti- mize separations by varying separation

parameters such as stationary phase and/or mobile phase composition and column

temperature. An understanding of these fundamental retention and selectivity mechanisms facilitates the optimization of separations in gas chromatography (GO,

liquid chromatography (LC), supercritical

fluid chromatography and extraction (SFC and SFE), and capillar}' electrophoresis (CE).

Recent research interests have focused on

the synthesis and characterization of bonded

stationary phases in LC and GC (e.g., monomeric/polymeric Ci8 phases and

charge transfer phases in LC and liquid

crystalline phases in GC), which offer unique capabilities for the separation of iso- meric compounds or compound classes. Researchers are investigating solute- stationary phase interactions using chromatographic and spectroscopic techniques and

chiral interactions in LC, GC, SFC, and CE.

In addition, NIST scientists are studying molecular modeling of solutes and stationary

phases to investigate retention mechanisms

and to correlate molecular descriptors with

retention. They also are investigating solute- matrix interactions in SFE.

Contacts: Lane C. Sander (301)975-3117

email: lane.sander@nist.gov

Stephen A. Wise

(301) 975-3112

email: stephen.wise@nist.gov

B208 Chemistry Building B208 Chemistry Building
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

NOVEL ANALYTICAL

SEPARATION SCIENCE

METHODOLOGY

Researchers are developing new, innovative approaches to separate and detect trace-level organic species in complex natural

matrices. One priority is the design, synthesis, and characterization of bonded stationary phases for liquid chromatography (LC), gas chromatography (GC), and supercritical

fluid chromatography (SFC). They also are developing novel separation media/modes

for electromigration separation techniques,

e.g., capillar}' electrophoresis (CE), capillary7

gel electrophoresis, micellar electrokinetic

capillar)' chromatography, and capillary

electrochromatography. In another effort, they are developing on-line multidimensional separation techniques based on

orthogonal methodologies (such as LC-GC,

LC-CE, LC-LC, and GC-GC) and fast separation technology in GC, LC, SFC, and CE. They also seek application of existing separation modes in novel combinations (e.g., chiral separations in SFC and CE), design of new separation systems based on micellar and liposomal phases, antibody/antigen

associations, and size-selective networks.

Research is under way on sensitive and/or

selective detection systems for microcolumn

separations, e.g., mass spectrometry,

laser-excited fluorescence, thermal-lens

absorbance, chemical reaction, and chemiluminescence approaches. They also are developing supercritical fluid extraction sys- tems for probing the interactions of analytes and matrices and for on-line coupled extraction and chromatography. Researchers are

investigating chromatographic and electro- phoretic approaches for the measurement of

physico-chemical properties such as octanol/water partition coefficients, aqueous

solubilities, and vapor pressures. Another

effort involves designing micro-fluidic sys- tems for capillary flow injection analysis,

electrophoresis, and electrochromatography. Research will emphasize applications to environmental, clinical, nutritional, and

forensic disciplines.

Contacts: Stephen A. Wise (301)975-3112

email: stephen.wise@nist.gov Lane C. Sander

(301) 975-3117

email: lane.sander@nist.gov

B208 Chemistry Building

SEPARATION SCIENCE

TECHNIQUES FOR TRACE

ORGANIC ANALYSIS

Researchers are developing and applying

separation techniques such as gas chromatography (GC), liquid chromatography

(LC), supercritical fluid chromatography

(SFC), and capillary electrophoresis (CE)

for trace-level determination of organic and

organometallic compounds. Researchers are developing extraction systems for selective removal of analytes from natural matrices,

e.g., supercritical fluid extraction (SFE), pressurized fluid extraction (PFE), and

microwave-assisted extraction. They also are developing chromatographic and electrophoretic approaches for sample preparation and clean-up and analyte preconcentration

prior to analysis by LC, GC, SFC, or CE.

Another project seeks to develop off-line and

on-line multidimensional separation proce- dures (e.g., LC-GC, LC-LC, SFE-GC, and

LC-CE) to measure individual species in complex mixtures. NIST researchers are developing and using simultaneous multiple and/or selective chromatographic and

electrophoretic detection systems (e.g., mass

spectrometric, electron capture, atomic emission, flame photometric, infrared, UV-visible diode array, fluorescence, electrochemical, and chemical reaction detectors) to enhance measurement selectivity or sensitivity or

both. Recent activities have emphasized

applications in environmental, clinical, and

forensic areas, including the determination

of environmental contaminants such as polychlorinated biphenyls, polycyclic aromatic hydrocarbons, pesticides, and

organometallic species in natural matrices such as sediment, tissue, and air particulate material; nutrients such as vitamins and

carotenoids in food and serum; drugs of abuse in urine and hair; and biomolecules such as proteins, peptides, and DNA frag- ments. Research opportunities exist within

the division for the application of these separation techniques to trace inorganic

analysis problems.

Contacts: Stephen A. Wise

(301) 975-3112

email: stephen.wise@nist.gov Michele M. Schantz

(301) 975-3106

email: michele.schantz@nist.gov

B208 Chemistry Building
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

HIGH-ACCURACY

COULOMETRY

The coulometry program entails a broad spectrum of research interests and activities, including improving the precision and accuracy of coulometric methods, determining chemical stoichiometry, redetermining

physical constants (such as atomic weights, and the Faraday constant), and developing new methods and instrumentation includ- ing microcoulometry. The application of absolute coulometric methods to the standardization of primary chemical standards and to the calibration of other analytical

techniques is also a prime concern. Instru- mentation is available for constant-current and controlled potential coulometric measurements.

Contact: Kenneth W. Pratt

(301) 975-4131

email: kenneth.pratt@nist.gov B324 Chemistry Building

INORGANIC

ELECTROANALYTICAL

CHEMISTRY

Research interests encompass all areas of inorganic electroanalytical chemistry, with

specific interests in fundamental studies of pH, such as modeling the liquid junction

potential; measurements of acid dissociation

constants; theory and metrology of aqueous and non-aqueous electrolytic conductivity;

high-precision coulometric research; and

the development of electrochemical detection systems. NIST scientists give special

attention to the development of novel electrochemical instrumentation and the application of electroanalytical techniques

to matters of national importance. Instru- mentation is available for precise pH,

electromotive force, conductimetric, coulometric, potentiometric, and voltammetric measurements.

Contact: Kenneth W. Pratt (301) 975-4131

email: kenneth.pratt@nist.gov B324 Chemistry Building

TRACE-GAS ANALYSIS

Researchers are using Fourier transform

infrared spectroscopy (FTIR), tunable diode

laser adsorption spectroscopy, gas chromatography, electrochemical analysis, and

other specialized analysis techniques to develop primary standard gas mixtures and

to measure trace gases in air, the environ- ment, stack emissions, and process streams. One goal is to analyze complex mixtures of gases emitted from process streams in real time using spectroscopic techniques. Another is to develop a quantitative database

of FTIR spectra of volatile organic compounds for use in remote monitoring.

Researchers also are seeking to measure

extremely low-level contaminant gases in ultrapure materials, to develop standards, and to analyze trace gases that are important in ambient atmospheric measurements.

Additionally, researchers are pursuing analysis of environmentally important trace gases

in air and from point sources and the devel- opment of very low concentration volatile organic standards.

Contact:

Franklin R. Guenther

(301) 975-3939

email: franklin.guenther@nist.gov

B156 Chemistry Building

OPTICAL TECHNIQUES

FOR TRACE-GAS

ANALYSIS

This project involves development of optical techniques for trace-gas analysis with appli- cations in areas such as environmental and

industrial process monitoring. Recent improvements in laser devices and data

acquisition systems offer opportunities to extend highly sensitive spectroscopic tech- niques to detect and quantify the components of various gas mixtures. In particular,

sensitive analytical detection techniques for molecules consisting of five or more atoms

are desirable. Current approaches include

Fourier transform infrared spectroscopy, tunable diode laser absorption spectroscopy, and polarization spectroscopy using a solidstate laser system.

Contacts: Pamela M. Chu

(301) 975-2988

email: pamela.chu@nist.gov B324 Chemistry Building

Franklin R. Guenther

(301) 975-3939

email: franklin.guenther@nist.gov

B156 Chemistry Building

SPECTROSCOPY

STANDARDS AND

PROCESS ANALYSIS

Spectrophotometers are important tools for

quality assurance, process control, and regulatory compliance measurements. To ensure

that these devices are performing properly, NIST manufactures and certifies Standard

Reference Material optical filters. Currently, NIST provides materials and filters to measure wavelength accuracy, assess photometric

accuracy, and determine the amount of

stray light in ultraviolet and visible spectro- photometers. NIST is conducting research to extend its offerings to the near-infrared
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

region where Fourier transform nearinfrared (FT-NIR) spectroscopy and Fourier transform Raman (FT-Raman) spectroscopy have become viable, routine techniques,

especially for process monitoring. NIST is

I investigating the use of FT-NIR in combination with FT-Raman to identify and quantify mixtures in sealed containers. An example is

the quantitation of mixed oxygenates in

sealed ampoules of reformulated gasoline. A

future goal is the design and evaluation of a combined NIR/Raman instrument for real- time identification and quantitation of mixtures in a process stream.

1 Contacts:

[ John C. Travis

(301) 975-4117

email: john.travis@nist.gov

Steven J. Choquette

j (301) 975-3096

email: steven.choquette@nist.gov

A213 Chemistry Building

LABORATORY

AUTOMATION

TECHNOLOGY AND

STANDARDS

The thrust of this program is to develop,

evaluate, and demonstrate new concepts

j that eventually can lead to the successful,

! routine application of laboratory auto- mation. The full potential of automated

chemical analysis systems has not been

achieved because the process of intercon- necting analytical and clinical chemistry

laboratory devices remains resource-inten1 sive and difficult. A general lack of interfac- ing standards, a dearth of instruments

designed from a systems-use perspective, and an over-reliance on the anthropomorphic model further exacerbate the situation.

I To facilitate the automation of the analytical laboratory, standard methods for instru- ment-to-controller communication, device

control, data and material transfer, and

error and exception handling are needed to provide instruments with realistic plug-andplay interfaces. New instrument designs need to allow remote control, provide auto- mated access to sample and material ports, and exhibit system-centric behavior.

Contact: Gary W. Kramer

(301) 975-4132

email: gary.kramer@nist.gov A213 Chemistry Building

AUTOMATED SAMPLE

PREPARATION AND

SENSING

Scientists often must prepare samples before

analysis using extraction, digestion, or other

isolation and purification techniques. NIST

researchers are developing new chemistries, miniaturization approaches such as microfluidics, and automation for techniques such as supercritical fluid extraction, solid- phase extraction, and flow injection. These automated sample preparation methods are being coupled with new and existing

microseparation/detection schemes such as

capillary electrophoresis, immunoassaybased techniques, and biosensors for

real-time monitoring of chemical and bio- chemical reactions in flow- and batchprocesses. NIST's sensor research focuses on

the development of inexpensive yet sensitive

devices. Research involves the use of immobilized antibodies for attenuation,

fluorescent, chemiluminescent, optoelectro- chemical, and interferometric approaches to provide selectivity and detectability in

microfluid assays. In addition, NIST is investigating the combination of microflow injection analysis and capillary electrophoresis with optical waveguide detection for laboratory-on-a-chip applications.

Contacts: William A. MacCrehan

(301) 975-3122

email: william.maccrehan@nist.gov

Gary W. Kramer

(301) 975-4132

email: gary.kramer@nist.gov

A213 Chemistry Building

ANALYTICAL

INFOMETRICS

To ensure that chemical information necessary for decision making can be provided in an efficient and timely manner, NIST is investigating all aspects of the measurement

process, including experimental design; data validation, storage, and retrieval; chemometrics, multivariate statistics, and

applied mathematics; data rectification and

meta-analysis; quality control, assurance, and improvement; and instrument control and communications. Examples include

multivariate infrared and Raman spectros- copy for characterization of organic mixtures using multivariate statistical models,

graphical methods for analysis and presentation of interlaboratory comparison studies, development of standards for laboratory

automation, and improved methods for evaluating and utilizing analytical measure- ment uncertainties.

Contact: David L. Duewer

(301) 975-3935

email: david.duewer@nist.gov A213 Chemistry Building
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

CHEMICAL ANALYSIS

WITH NEUTRON BEAMS

The use of prompt radiations from nuclear

reactions is well established as a tool for ele- mental analysis and compositional mapping. Two techniques are used at NIST: neutron-capture prompt-gamma-ray activation analysis (PGAA) and neutron depth

profiling (NDP). Each employs both ther- mal- and cold-neutron beams from the NIST Center for Neutron Research. PGAA is used to determine a suite of elements that

are inaccessible by conventional neutron

activation analysis, such as hydrogen,

boron, carbon, and nitrogen, as well as those with large capture cross sections, such

as cadmium, gadolinium, and mercury. NDP measures the depth distribution of nuclides that emit charged particles on slow- neutron capture. Researchers are developing methods with improved specificity, accuracy, sensitivity, and spatial resolution through detailed studies of the interaction of neutrons and their products with samples and detectors.

Contacts: Richard M. Lindstrom

(301) 975-6281

email: richard.lindstrom@nist.gov

Robert R. Greenberg

(301)975-6285

email: robert.greenberg@nist.gov

B125 NIST Center for Neutron Research

NEUTRON ACTIVATION

ANALYSIS

Neutron activation analysis (NAA) provides

the sensitivity, selectivity, and capability for multielemental determinations that are

often required in studies involving the role

of trace elements in biological, environ- mental, and materials analysis studies. Due

to their unique capabilities, the various NAA

techniques frequently play an important

role in the certification of elemental concentrations in NIST Standard Reference

Materials. The accuracy and precision of the various forms of NAA ultimately are limited by the precision of counting statistics that in favorable cases may be a few tenths of a percent. However, to achieve this level of accuracy, all other sources of error must be reduced to comparable levels. Experimental and computational studies address such matters as new and improved chemical separation procedures, neutron and gamma-ray

interactions with analytical samples and

detectors, high-accuracy neutron flux monitoring, high and varying count-rate gammaray spectrometry, peak integration routines, and gamma-ray and fast-neutron interferences. A variety of nuclear spectrometry equipment, laboratory facilities, personal and minicomputer facilities, and the irradiation facilities of the NIST Center for Neutron

Research are available for this work.

Contact: Robert R. Greenberg

(301) 975-6285

email: robert.greenberg@nist.gov B125 NIST Center for Neutron Research

FOCUSING OF COLD

NEUTRONS FOR

ANALYTICAL

MEASUREMENTS

The availability of long wavelength neutrons and recent advances in neutron optics provide an opportunity to design analytical

probes for use in materials research. The

purpose is to measure the concentration of the elements in a fine (sub-millimeter), two-dimensional array across the surface of a material. The detection limit of neutron

absorption experiments will be improved by

using optical elements to focus long wavelength neutrons onto small sample areas.

Different methods can be used to focus cold neutrons; the emphasis is on those based on

the principle of total external reflection of neutrons at small grazing angles. These

include polycapillary glass fibers, metal capillaries, nickel-coated conic sections of revolution, nickel-coated curved micro-guides, and curved channel plates. However, in all

cases, focusing is achieved at the expense of increased angular divergence. Therefore, it

is more useful for measurement techniques

that are dependent only on the neutron capture reaction rate and not on collimation. Such a system would have an impact on the

detection limits for absorption techniques such as prompt gamma activation analysis and neutron depth profiling.

Contacts: David F.R. Mildner

(301) 975-6366

email: david.mildner@nist.gov Heather Chen-Mayer

(301) 975-3782

email: h.chen-mayer@nist.gov

B125 NIST Center for Neutron Research
CHEMICAL SCIENCE AND TECHNOLOGY LABORATORY

RESEARCH

FACILITIES

FLUID FLOW

MEASUREMENT AND

RESEARCH FACILITIES

The NIST flow measurement facilities are used to establish, maintain, and disseminate

flowrate measurements, standards, and data

for the wide range of conditions needed by

U.S. industry and government agencies.

Industry requests include flowmeter calibrations, special tests, round-robin testing pro- grams to establish realistic traceability chains in the form of flow measurement

assurance programs, data-generation pro- grams for industrial groups and trade associations, and use of testbeds for earn ing out

industrial research programs focused on

flow measurement topics.

The metering research facilities combine pri- mary' calibration techniques with the capability to conduct detailed surveys of fluid flows that affect flowmeter performance. These capabilities include computational

fluid dynamics (CFD) as well as laser Doppler velocimetry techniques used mainly

in water flow facilities. CFD techniques

, include commercially available codes as

' well as specialized codes tailored to specific conditions.

CAPABILITIES Fluid flow facilities enable a range of fluid and flow conditions in a wide range of pipe

sizes:

• Water: maximum flowrate of 40 000 L/min up to 0.5 m diameter with temperature near ambient and pressure up to 1.01 MPa(lOatm).

• Hydrocarbon liquids having densities of

0.6 - 0.8 gms/cc and kinematic viscosities of 1-30 centistokes: maximum flowrate of 1600 L/min in tubes and pipes up to 50 mm in

diameter with temperature near ambient and pressure up to 1.01 MPa (10 atm).

• Air: maximum flowrate of 85 m

3 per minute in pipes up to 100 mm in diameter

with temperature near ambient and pressure up to 3.55 MPa (35 atm).

• Gas flows having variable composition and temperature: the component gases of auto exhaust with flows totaling 2.8 m

3 per minute in 50-millimeter pipes and temperatures to 400 °C.

APPLICATION These facilities are used to establish and

maintain the national standards for fluid flowrate measurement systems to achieve

orderliness in the marketplace, to produce

satisfactory measurements for optimizing

productivity in continuous industrial processes, and to monitor environmental quality. These facilities also are used to generate

critical databases needed to initiate or update the national standards on generic

fluid-metering topics. These standards are used for accurate custody transfer of fluid resources or products in the domestic and

international marketplace or for studying

critical industrial processes. Potential users

are industries involved in the custody transfer of fluid resources and products, the chemical and petrochemical industries, the power and energy-generation industries, the auto industries, and government agencies such as NASA, the U.S. Department of Defense, and the U.S. Environmental

Protection Agency.

AVAILABILITY The facilities are available upon request to

U.S. industry, other government agencies, and academia for collaborative research

projects, including calibrations of flow- meters or other pipeline elements.

Contact: George E. Mattingly

(301) 975-5939

email: george.mattingly@nist.gov

105 Fluid Mechanics Building

LIQUID-NITROGEN FLOW

MEASUREMENTS

The liquid-nitrogen flow measurement facility serves as the national calibration facility

for cryogenic flow measurement devices. The facility incorporates a dynamic gravi- metric method to measure liquid nitrogen. Well instrumented for monitoring temperature, pressure, and time, the facility also is capable of determining volumetric flow

rates. The facility is located completely

indoors and is not subject to environmental

changes.

CAPABILITIES The facility has a flowrate range of approximately 1 kg/s to 10 kg/s. The pressure can

vary from 0.4 MPa to 0.76 MPa at temperatures between 80 K and 90 K. In this closed- loop flow facility, NIST researchers can

establish and maintain stable flow conditions for extended test periods. For volumetric flow measurements, the density is determined by making pressure and temperature measurements and calculating

density from an equation of state.

APPLICATIONS The nitrogen flow facility is used primarily

as a calibration facility for cryogenic flow- meters; however, it also can be used for developmental testing and evaluation. NIST

researchers are able to vary the system

parameters and evaluate flowmeter sensitivity to variables other than flowrate. Because

they can accurately measure fluid properties

as well as flowrate, the facility also can be used to evaluate pressure and temperature

sensors associated with the flowmeters.

AVAILABILITY

Collaborative or proprietary programs for

this test facility can be arranged. The facility must be operated by NIST staff.

Contact:

Jennifer L. Scott (303) 497-3684

email: jscott@boulder.nist.gov Mailcode 838.07

Boulder, Colo. 80303-3328
ELECTRONICS AND ELECTRICAL

ENGINEERING LABORATORY

The Electronics and Electrical Engineering Laboratory (EEEL) provides the fundamental basis for all electrical measurements in the United States. In close consultation with industry, research and

calibration programs are tailored to meet

the most critical measurement needs for

the manufacture and operation of electrical and electronic systems, including

semiconductor, magnetic, radio- frequency, microwave, optical, optoelectronic, and superconducting equipment;

flat-panel displays; electronic instrumentation; and electrical power apparatus and

systems.

Other programs are concerned with basic research to develop quantum standards

that enable more accurate maintenance

of the fundamental electrical units. Laboratory researchers also conduct studies on

the new measurements needed for the successful development of promising future technologies such as high-temperature

superconductors, quantum mechanical

devices, and hybrid computer chips that

utilize both electronic and lightwave signals. These measurement techniques, as well as Standard Reference Materials developed for optical fiber diameter,

silicon resistivity, and superconducting

critical current, play a significant role in helping to improve the efficiency and

quality of manufacturing.

In addition, the laboratory manages

metrology development work across NIST

in response to the needs of mainstream

silicon semiconductor device manufacturing. It also applies science and technol- ogy to solve key problems of the criminal

justice communities.

Contact: Judson C. French, Director (301) 975-2220

email: judson.french@nist.gov

fax: (301) 975-4091 B358 Metrology Building

www.eeel.nist.gov

COOPERATIVE RESEARCH

OPPORTUNITIES

77 Office of Microelectronics Programs

77 Office of Law Enforcement Standards

Electricity

77 Resistance Standards and Materials

78 Quantum Hall Effect

78 Applying High-Tc Superconductors to Precision Electrical Measurements

78 Josephson-Effect Voltage Standards

79 Advanced AC-DC Voltage and Current Measurements

79 Synthesis of Precise Signals

79 Testing Electronic Systems

79 Fast Pulse and Waveform Acquisition Standards

80 Metrology for Electrical Power Systems

80 Dielectrics Research

80 Plasma Processing/Plasma Chemistry

81 Video Processing

81 Metrology for Flat-Panel Displays

81 Integrated Infrastructure for Electronics Design

82 Integrated Infrastructure for Electronics Manufacturing

Semiconductor Electronics

82 Metrology for Nanoelectronics

82 Optical Characterization Metrology

83 Scanning Probe Microscope Metrology

83 Thin-Film Process Metrology

83 Silicon-on-lnsulator Metrology

84 Metrology for Modeling and Simulation

84 Metrology for Process and Tool Control

84 Interconnect Reliability Metrology

84 Dielectric Reliability Metrology

85 Microelectromechanical Systems

Electromagnetic Fields

85 Guided-Wave Microwave Standards and Measurements

86 High-Speed Microelectronics

86 Electromagnetic Characterization of Materials

87 Electromagnetic Interference and

Compatibility

87 Antenna Measurements

Electromagnetic Technology

87 Josephson Array Development

88 Nanoscale Cryoelectronics

88 High-Performance Sensors, Infrared Detectors, and Mixers

88 Superconductor Standards and Technology

89 Superconductor Interfaces and Electrical Transport

89 High-Temperature Superconducting

Electronics

89 Magnetic Recording Metrology

90 Magnetic Instruments and Materials

Characterization

90 Nanoprobe Imaging for Magnetic

Technology

Optoelectronics

90 Laser Radiometry

91 High-Speed Optoelectronic Measurements

91 Fiber-Optic Metrology

92 Integrated Optic Metrology

92 Optical Fiber Sensors

92 Fiber and Discrete Components

93 Dielectric Materials and Devices

93 Semiconductor Materials and Devices

RESEARCH FACILITIES

93 Semiconductor Processing Laboratory

94 Molecular-Beam Epitaxy Facility

94 Wafer Probing Laboratory

95 Mode-Stirred Chambers

95 Ground Screen Antenna Range

95 Transverse Electromagnetic Cell

96 Electromagnetic Anechoic Chamber

96 Concentric Loop Antenna Systems

97 Standard Transient/Impulsive Field

Facility

97 Mobile Transient Reception/Transmission

System

97 Integrated-Circuit Fabrication Laboratory

97 Ultralow-Temperature Electronics Facility

98 Magnetic Thin-Film Fabrication and

Imaging Facility

98 Near-Field Scanning Facility for Antenna Measurements
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

COOPERATIVE RESEARCH

OPPORTUNITIES

OFFICE OF

MICROELECTRONICS

PROGRAMS

The Office of Microelectronics Programs

(OMP) serves as an information focal point

for semiconductor-related research at NIST. OMP is responsible for matrix management

and contemporary relevance of the National Semiconductor Metrology Program (NSMP).

OMP also manages NIST's strong working

relationships with the Semiconductor Industry Association (SIA), the Semiconductor

Research Corp. (SRC), and SEMATECH.

1 The NSMP was established by Congress

1 (within the Department of Commerce) in 1994 in direct response to industry needs. The FY 1998 program portfolio consists of 23

multiyear projects with activities spanning

nearly all of the NIST laboratory organizations. Strong emphasis is on metrological

issues for mainstream silicon CMOS technol- ogy identified in the National Technology

Roadmap for Semiconductors (SIA, 1997). OMP actively seeks industry collaborations

in support of the portfolio and sets priorities based on direct industry contact and

through participation in the planning activities of the SIA, SRC, and SEMATECH. Results from NSMP activities are largely public information and are freely available to domestic manufacturers.

Contact: Robert I. Scace

(301) 975-4400

email: scace@nist.gov

fax: (301) 975-6513 A323 Technology Building

www.eeel.nist.gov/810.01

OFFICE OF LAW

ENFORCEMENT

STANDARDS

The mission of the Office of Law Enforce- ment Standards (OLES) is to apply science and technology to the needs of the criminal

justice community, including law enforce- ment, corrections, forensic science, and fire

service. To accomplish this mission, OLES

develops methods for testing equipment per- formance and for examining evidentiary

materials; develops standards for equipment and operating procedures; develops Standard

Reference Materials; and performs other

scientific and engineering research as requested by sponsoring agencies.

The areas of research investigated by this

office include clothing, communication sys- tems, emergency equipment, investigative

aids, protective equipment, security systems,

vehicles, speed measuring equipment, weapons, analytical techniques, and Standard

Reference Materials used by the public safety community. Specific projects are based upon

the most recent recommendations of the Law Enforcement and Corrections Technology Advisory Council and vary depending upon the priorities of the criminal justice community.

Contact: Kathleen M. Higgins

(301) 975-2757

email: kathleen.higgins@nist.gov

fax: (301) 948-0978 A323 Technology Building

www.eeel.nist.gov/810.02

Division Contact: William E. Anderson

(301) 975-2400

email: william.anderson@nist.gov

fax: (301) 926-3972 B164 Metrology Building

www.eeel.nist.20v/8ll

RESISTANCE STANDARDS

AND MATERIALS

Component precision resistors of both film and wire construction have found wide- spread use as references and dividers in precision instrumentation such as digital multimeters and calibrators. The quality of these resistors and their level of immunity to

the effects of environmental parameters, such as temperature and mechanical shock, have enabled the 3-month performance of these instruments to begin to approach that

of the standards most commonly used to

calibrate them. This fact and the desirability

of calibrating such instruments where they

will be used have heightened the need for a

next generation of resistance standards

standards whose performance in adverse conditions would eclipse that of existing standards in a laboratory environment.

NIST scientists are beginning a program to develop new standards with significantly

improved performance, both short- and

long-term, under field conditions. To do so, the electrical/physical properties of a number of alloys are being investigated, and new

resistor designs are being formulated and

tested. Future efforts will investigate metallurgical techniques such as rapid quenching, ion implantation in semiconductors
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

and glasses for resistors >10 , and Evanohm

or Nichrome film deposition on Si substrates. The desired output will be fixed- value standards in the range from 1 ohm to 10

12 ohms with fractional drift rates of less than 10" 6 per year, fractional temperature

coefficients of less than 1(T

7 per °C, and low power and voltage coefficients. A metallurgical facility with the capability of monitoring

the electrical properties of materials during

annealing and a silicon processing facility

are available, along with access to precision

resistance measurement systems and the national resistance standards.

Contacts: Ronald F. Dziuba

(301) 975-4239

email: ronald.dziuba@nist.gov

Alan F. Clark

(301) 975-2139

email: alan.clark@nist.gov

B258 Metrology Building

QUANTUM HALL EFFECT

The quantum Hall effect now provides the

basis for the national unit of resistance. The

representation of the resistance standard presents many interesting problems. Researchers at NIST are investigating the physical

principles underlying the effect, under- standing sample-specific artifacts, exploring

the ac quantum Hall effect, and improving

the measurement systems. Research is being conducted on the range of parameters over which the quantum Hall effect provides the most accurate and reproducible standard of

resistance.

Using GaAs heterostructures grown at NIST,

researchers are using a dedicated class-10 clean room facility to investigate different methods of making contacts to the devices

that will have very low resistances (in the milliohm range) even at temperatures below

4.2 K and in high magnetic fields.

NIST researchers also are working to improve and simplify the measurement sys- tems used to calibrate resistors; a new 'He

refrigerator and l6-tesla magnet facility have been developed for use with a new cryo- genic current comparator. This improved

the accuracy of NIST calibrations severalfold.

Contacts: Marvin E. Cage

(301) 975-4224

email: marvin.cage@nist.gov

Alan F. Clark

(301) 975-2139

email: alan.clark@nist.gov

B258 Metrology Building

APPLYING HIGH-Tc

SUPERCONDUCTORS TO

PRECISION ELECTRICAL

MEASUREMENTS

NIST and other national standards laboratories for years have used cryogenic current comparators (CCCs) to make ratio measure- ments of voltage, current, and resistance with relative uncertainties of 10"' or less. This approach has not found widespread

commercial use because the cryogenic current comparator must be operated at liquid- helium temperatures, which presents a

variety of operational difficulties. Moreover,

existing comparators are working prototypes

rather than completed instrumentation sys- tems and are difficult to use.

Recent advances in superconductivity tech- nology have made the application of hightemperature superconductors practical. In at

least one case, an integrated-circuit super- conducting quantum interference device magnetometer, similar to devices used in CCCs to detect low levels of magnetic flux, has been built that operates at liquid- nitrogen temperatures. Thus, the possibility

for developing a commercial instrument based on a CCC now has been opened. Such

an instrument might be run with a refrigerator at liquid-nitrogen temperatures.

This development and the possibility of commercialization make it feasible to automate

the basic CCC design, which then will be more attractive for general calibration use. NIST scientists are engaged in designing,

building, and testing CCCs to support measurements of the new national resistance standards based on the quantized Hall effect. This involves establishing a few select ratios

that range from 1:1 to 100:1. Future efforts

will include the development of CCCs with

selectable ratios over a somewhat larger range.

Contacts: Ronald F. Dziuba

(301) 975-4239

email: ronald.dziuba@nist.gov

Randolph E. Elmquist

(301) 975-6591

email: randolph.elmquist@nist.gov

B258 Metrology Building

JOSEPHSON-EFFECT

VOLTAGE STANDARDS

High-accuracy voltage-standard systems have proliferated among many industrial, government, and international standards

laboratories with the advent of the Josephson-array device. Within this labora- .

tory, there are three array voltage-standard , systems in operation, including a fully automated 10-volt array system. Guest

researchers can gain hands-on experience with array system operation and verification and cooperate on studies into both precision

voltage metrology and Josephson-array

physics.

The metrology goals are to improve meas- 1 urement precision to better than one part in -

10

8 in applications of direct system-to- system intercomparisons and lab-to-lab volt

transfers, achieve greater reliability in autoj mation algorithms, and further the develop- ! ment of solid-state reference standards and

precision digital voltmeters.
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

The physics research addresses the effects of electromagnetic noise on the stability and

accuracy of the Josephson quantized-voltage

steps, studies the boundaries of chaotic behavior in junction-junction interactions, and explores other possible array device

applications, such as the generation of ac signals through frequency modulation of

the millimeter-wave drive frequency.

Contacts: Richard L. Steiner

(301) 975-4226

email: richard.steiner@nist.gov Alan F. Clark

(301) 975-2139

email: alan.clark@nist.gov

B258 Metrology Building

ADVANCED AC-DC

VOLTAGE AND CURRENT

MEASUREMENTS

Thermal voltage and current converters

offer the most accurate and broadband method for measuring ac voltage and current for applications in communications,

power generation, aerospace, and defense. Thermal transfer standards are calibrated by NIST in terms of reference converters, which

themselves have been characterized by refer- ence to the NIST primary standards

special multijunction thermal converters whose performance is known. These primary and working standards in common use throughout the metrology community

employ thermal converters fabricated from

wire elements. Researchers at NIST are studying new methods for the manufacture

of film thermal converter structures made

by the use of photolithography on silicon

substrates. The application of this new tech- nology may result in improved performance

and reduction in the cost of thermal

converters.

Contacts: Joseph R. Kinard

(301) 975-4250

email: joseph.kinard@nist.gov

Barry A. Bell

(301) 975-2419

email: barry.bell@nist.gov

B162 Metrology Building

SYNTHESIS OF PRECISE

SIGNALS

NIST is conducting both theoretical and

experimental research on the synthesis of precision ac waveforms for use in ac voltage standards operating nominally below

100 MHz and producing both sinusoidal and

arbitrary waveforms. The theoretical work

includes Walsh functions and Fourier analysis, time-domain analysis, and precision RMS-to-dc conversion techniques. Experi- mental work involves high-speed, high- accuracy digital-to-analog conversion;

precision, high-speed switching; assembly

and interpretive-level programming for hardware control; and wideband, fastsettling amplifiers.

Contacts:

Nile M. Oldham

(301) 975-2408

email: nile.oldham@nist.gov

Barry A. Bell

(301) 975-2419

email: barry.bell@nist.gov

B162 Metrology Building

TESTING ELECTRONIC

SYSTEMS

NIST scientists are developing new testing approaches for electronic systems to mini- mize the attendant testing costs while ensuring product quality. Program emphasis is on

development and application of generic

error modeling methods for describing the systems to be tested. Once an accurate model is available, it can predict the per- formance of a device based on the fewest

possible tests. Theoretical work centers on

dimensionality selection for empirical models to minimize prediction errors and on the assignment of uncertainties and confidence

limits when making predictions based on

empirical models. Results of this work are being used by the semiconductor industry

to reduce the costs of testing mixed-signal

integrated circuits and by electronic instru- ment manufacturers to cut the high costs of calibration test points.

Contacts:

T. Michael Souders

(301) 975-2406

email: t.souders@nist.gov Barry A. Bell (301) 975-2419

email: barry.bell@nist.gov

B162 Metrology Building

FAST PULSE AND

WAVEFORM ACQUISITION

STANDARDS

NIST has an active program to provide a

basis for characterizing both the time domain and frequency domain performance

of sampling and digitizing systems, includ- ing analog/digital converters, sampling

oscilloscopes, and waveform recorders. Theoretical and experimental research

establishes test methods, reference waveforms, and state-of-the-art sampling tech- nology to support these systems. Research
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

areas include opto-electronic and electrooptical techniques for sampling and

pulse generation in the 1-picosecond to 5-picosecond regime; advanced signal processing methods, including deconvolution,

phase-plane compensation and spectral esti- mation; and ultrahigh accuracy techniques

to support modern sigma-delta sampling

technology.

Contacts:

T. Michael Souders

(301) 975-2406

email: t.souders@nist.gov

Barry A. Bell (301) 975-2419

email: barry.bell@nist.gov

B162 Metrology Building

METROLOGY FOR

ELECTRICAL POWER

SYSTEMS

Electrical measurements are critical to the operation of electrical power systems in many ways; they are fundamentally important to the control of power flow, the mainte- nance of reliability and quality, and the revenue metering of electrical power. NIST

research is conducted to support the high

reliability of electric power delivery, public

safety, and fairness in the sale of electric power to customers.

Nearly all equipment installed in the electric power system is subjected to acceptance tests

at high voltage to ensure it can withstand

accidental high voltage surges as well as those occurring during normal system operation. NIST researchers are working both to improve the precision of conventional methods traditionally used in high voltage testing

as well as to develop optical and electrooptical techniques that complement and

offer significant advantages over conventional measurement approaches. Power

quality is also of great concern for utilities, which provide the electric power, and for consumers, who have equipment such as

computers that is sensitive to electric power

surges, sags, and other transient phenomena. NIST is working with the electric power

industry to identify the sources and presence

of electric power degradation and to miti- gate its effects on sensitive equipment.

Magneto-optical measurement devices of

electrical current are being developed for metering of electrical power. Research at NIST includes the verification of the accuracy of these devices that are being intro- duced into the power system. Other research

areas include measurement of electric and

magnetic fields and precision measurements

of electric power and energy.

Contacts: Gerald J. FitzPatrick (301) 975-2737

email: gerald.fitzpatrick@nist.gov James K. Olthoff (301) 975-2431

email: james.olthoff@nist.gov

B344 Metrology Building

DIELECTRICS RESEARCH

NIST scientists are developing measurement

methods to characterize dielectrics used as

electrical insulators in electric power sys- tems. Emphasis is on the investigation of phenomena that affect reliability and safety associated with operation of electrical sys- tems. Specific projects include investigation

of the production of toxic byproducts in electrical discharges, research on the environ- mental impact of the use of gaseous

dielectrics, and the development of diagnostics for predicting failure (or breakdown) of insulating materials. Theoretical work

addresses Boltzmann equilibrium statistics, chemical kinetic computer codes, and

computer-aided data acquisition and analysis. Experimental work focuses on highvoltage ac and dc tests, gas chromatography and mass spectrometric techniques for

chemical characterization, and partial dis- charge measurements in cables and in gas- and liquid-insulated systems.

Contacts: Loucas G. Christophorou

(301) 975-2432

email: loucas.christophorou@nist.gov James K. Olthoff (301) 975-2431

email: james.olthoff@nist.gov

B344 Metrology Building

PLASMA PROCESSING/

PLASMA CHEMISTRY

NIST scientists are investigating the chemical and physical processes occurring in low- temperature discharges by applying a wide range of diagnostics to well-characterized discharges that are similar to those used in the manufacturing of microelectronic

devices. The goal of this research is to improve the measurement techniques

required to ensure the reproducibility and

control of semiconductor etching dis- charges. The discharges under study include radio-frequency (rf) discharges (generated

in Gaseous Electronics Conference rf refer- ence cells, a standard cell used by research

labs worldwide) and low current dc Townsend discharges. Diagnostics applied to these discharges include mass spectrometric detection of neutral and ionic species generated

in the discharges, analysis of discharge

electrical parameters, detection of plasma

optical emission, and laser-induced fluorescence. Additional areas of research include

the accumulation and critical analysis of standard reference data (such as cross sections and rate coefficients) for use by the semiconductor industry, the measurement

of electron attachment cross sections for
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

etching gases, and the investigation of the

role of surface charging in low-temperature

discharges.

Contact: James K. Olthoff

(301) 975-2431

email: james.olthoff@nist.gov B3-H Metrology Building

VIDEO PROCESSING

Video quality presently is evaluated using

subjective means; however, the exploding

digital video revolution requires significantly more sophisticated and accurate measurements. The static test patterns and

linear measurement tools for analog video systems do not characterize adaptive, nonlinear digital compression systems. NIST is developing a collection of measurement

tools for the testing and evaluation of digital video signals subjected to compression processing. Similarly, measurement techniques

are being developed for the evaluation of the

visual performance of video displays.

One of the tools used for real-time video processing is the Princeton Engine, a video supercomputer. Consisting of 1,024 parallel

j processors with wideband video input and

output channels, each processor operates on

one picture element per video scan line, and

all processors execute the same instruction. Programming is accomplished using a subset of the C language having special constructions for parallel operation. Video

recorders, multiscan monitors, highdefinition monitors, and additional video support equipment are available. NIST

researchers are interested in using the Video

I Technology' Laboratory for a wide variety of

collaborative research projects. Such collaborations would focus on precompetitive

research with broad applications in advancing the state of the art in digital video systems.

Contact:

Charles Fenimore

(301) 975-2428

email: charles.fenimore@nist.gov A53 Technology Building

METROLOGY FOR

FLAT-PANEL DISPLAYS

Researchers at NIST are developing the measurement technology7 for the characterization of advanced image display sys- tems. A set of meaningful performance

specifications is needed that can be used to

assess display quality7 and that can be

applied across the wide spectrum of display

technologies that either are available or will become available shortly. Display quality

issues are not simply a matter of light measurement, power efficiency, display envi- ronment, or signal quality. Rather, many of

these factors act in concert to affect display

quality, with an important addition—the complexities of human visual perception. Research topics include the development of radiometric and colorimetric measurements

of emissive and non-emissive displays, the automation of such measurements, investigation of the visual perception of the eye, and modeling of display characteristics using the Princeton Engine video super- computer (see item on video processing).

Contacts: Edward F. Kelley

(301) 975-3842

email: edward.kelley@nist.gov James St. Pierre

(301) 975-4124

email: james.st.pierre@nist.gov

A53 Technology Building

INTEGRATED

INFRASTRUCTURE FOR

ELECTRONICS DESIGN

The electronics industry continues to move

toward a completely electronic, or computer

sensible, exchange of component information throughout the product life cycle, from

design to manufacturing to field support. The ability to represent accurately electronic

circuit geometry, behavior, and other parameters in standard computer file formats is crucial to the success of electronic commerce of component information

(ECCI) for electronics. Through the Inte- grated Infrastructure for Electronics Design

project, NIST scientists are working with the

electronics industry to develop the standards, infrastructure, methodologies, and

tools necessary to facilitate the exchange of

electronic product data—with a focus on

the design phase and the interface to manufacturing—in the global marketplace.

NIST researchers are working with industry

consortia, such as the Silicon Integration

Initiative and SEMATECH, and standards

organizations, such as the International

Electrotechnical Commission and the

Institute of Electrical and Electronics Engineers, to develop the standards, infrastructure, and methodologies necessary to allow the U.S. electronics component industry to compete aggressively in this global

marketplace. In response to industry needs, NIST has ongoing research in several areas:

• online data dictionaries,

• conformance and certification methodologies for the electronic design automation

(EDA) industry,

• EDA information model development,

• ECCI design life-cycle integration experi- ments,

• harmonization of existing and proposed

standards,
82 ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

• object-oriented electronic component representations, and

• specifications for ECCI utilities.

Contact: James St.Pierre (301) 975-4124

email: jimstp@nist.gov A53 Technology Building

INTEGRATED

INFRASTRUCTURE FOR

ELECTRONICS

MANUFACTURING

Electronics manufacturers face increasing

pressures in today's global manufacturing

environment, where being first to market is

often the chief determinant of market share. Increased competition pressures manufacturers to cut costs throughout the manufacturing process, and increased product

complexity forces manufacturers to maintain flexible factories of high-capital equip- ment and best-of-breed software

applications. In addition, globalization of the customer and supplier base drives the need for globally distributed manufacturing

facilities and suppliers. As a result, the manufacturing industry is in need of standards and technology to quickly and efficiently knit heterogeneous equipment and

software together and to rapidly transfer in- formation across corporate barriers and

multivendor computer environments. Through this project, NIST scientists are working with industry to develop and vali- date the use of open computer systems and

standards to meet this need.

NIST researchers have partnered with the National Electronics Manufacturing Initiative to develop and validate methodology

and standards to enable a "plug-and-play

factory." This industry-led project will rec- ommend a software framework for shopfloor integration, based on work being done

at Georgia Tech to evaluate the applicability

of candidate approaches for electronics manufacturing. NIST researchers also have teamed with industry in the Internet Commerce for Manufacturing project to develop and validate standards needed for electronic commerce of printed circuit assembly services. This effort is demonstrating the use of emerging, more comprehensive standards to move design information into the manufacturing process and to add efficiency to online contractual transactions.

Contact: Barbara Goldstein (301) 975-2304

email: bgoldstein@nist.gov A53 Technology Building

SEMICONDUCTOR

ELECTRONICS

Division Contact: David G. Seiler

(301) 975-2054

email: david.seiler@nist.gov

fax: (301) 948-4081 B344 Technology Building

www.eeel.nist.gov/812

METROLOGY FOR

NANOELECTRONICS

The goal of this project is to provide technological leadership to semiconductor and

equipment manufacturers by developing and evaluating the methods, tools, and artifacts needed to improve the state of the art

in compound semiconductor growth and

nanometrology (measurements on a scale of

10 nanometers to 100 nanometers). A stateof-the-art molecular-beam epitaxy facility is

devoted to in-situ metrology using a variety

of X-ray, optical, and electrical in-situ methods. Among these are an in-situ X-ray fluo- rescence probe, multiple wavelength

ellipsometry, X-ray reflectivity, and various radiometric methods to measure wafer temperature during deposition. A focused ion beam facility is used to fabricate nanostructures for both research and metrology of nanoscale devices. In-situ measurements of growth and structural parameters are being

examined in addition to fabrication properties required for the reliable manufacture of nanostructure devices. Research materials and methods to improve measurement

standards also are being developed.

Contacts: Joseph G. Pellegrino

(301) 975-2123

email: joseph.pellegrino@nist.gov

Wen F. Tseng

(301) 975-5291

email: wen.tseng@nist.gov

A305 Technology Building

OPTICAL

CHARACTERIZATION

METROLOGY

Optical spectroscopic studies in the visible and near-visible regions of the electromagnetic spectrum are invaluable for determining both materials- and device-related

properties. The ability to couple to electronic

states of interest in device applications and

their non-destructive nature make optical

spectroscopic analyses attractive research and analytical tools. Studies currently under way at NIST focus on understanding the

electronic and structural behavior of semi- conductor materials, such as Si, GaAs, and

SiGe; microstructures, including quantum

wells and superlattices; and photonic and

electronic devices. Excellent spectroscopic

facilities are available to perform highresolution photoluminescence,

photoluminescence-excitation, Raman

and resonance Raman scattering, reflection,
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

absorption, and modulation spectroscopic

measurements, such as electroreflectance and photoreflectance. The equipment used

includes high-resolution spectrometers, excitation lasers, cryostats, and associated optical and electronic instruments.

Contact: Paul M. Amirtharaj

; (301) 975-5974

email: paul.amirtharaj@nist.gov A305 Technology Building

SCANNING PROBE

MICROSCOPE

METROLOGY

Scanning probe microscopes (SPMs), such

as the atomic force microscope, are one of few techniques with the spatial resolution necessary to probe within individual transistors of state-of-the-art integrated circuits. This project applies SPMs to measure the

optically, vibrationally, and electrically pumped impedance between an SPM tip and

a semiconductor or device structure to deter- mine the spatial variation in their electrical

properties. For example, scanning capaci- tance microscopy (SCM) has been developed

as a technique to measure two-dimensional

(2D) dopant profiles within silicon transistors with 10-nanometer spatial resolution.

( Quantitative 2D dopant profiles are required

\ by the semiconductor industry to develop

next-generation integrated circuits. A

unique aspect of this work has been the development of a model of the SCM based on a finite element solution of Poisson's Equation for the capacitance between the SCM tip and a semiconductor. Results from

the model have been incorporated into

easy-to-use, personal-computer-based soft- ware that extracts dopant profiles from SCM

images. Other SPM-based techniques are being developed to measure lithographic

overlay, dielectric constant, and carrier

lifetime.

Contact: Joseph J. Kopanski

(301) 975-2089

email: joseph.kopanski@nist.gov A305 Technology Building

THIN-FILM PROCESS

METROLOGY

Fabrication of thin films of various types is a fundamental building block in the semiconductor device industry. Increasingly strin- gent requirements on the structure and

composition of these films are reflected in increasingly stringent requirements on the metrology tools and procedures used for process development and process monitoring. NIST researchers are developing

improved procedures, reference data, and

calibration artifacts to support in-situ process monitoring needs as well as in-line and

at-line measurements. Current activities focus on thin-film dielectrics. Research on

dielectrics, principally Si02 but also nitrides and layered structures, includes:

• improving ellipsometric characterization

of materials needed for gate dielectrics for

the year 2000 and beyond;

• developing an understanding of the

effect of interface roughness on accurately

determining the film properties needed by

industry;

• developing new and more flexible mechanisms for supporting traceability to NIST

in the area of measurement of thin-gate

dielectrics; and

• developing a database of high-accuracy

optical constants for silicon and important

dielectric layers at temperatures typical of

silicon processing steps.

Contact: James R. Ehrstein (301) 975-2060

email: james.ehrstein@nist.gov B310 Technology Building

SIUCON-ON-INSULATOR

METROLOGY

Silicon-on-insulator (SOI) wafers have

advantages over bulk silicon in process simplicity and for applications involving low

power, high temperature, integrated power, high speed, and radiation hardness. The

National Technology Roadmap for Semiconductors notes that development of low-cost SOI substrate wafers could advance inte- grated circuit performance a full generation. SOI has been identified as the material

of choice for the Defense Advanced Research

Projects Agency's Low Power Electronics Pro- gram, which is developing the infrastructure

for the fabrication of integrated circuits for the portable, battery-operated, communications and computer electronics of the future. This project supports development of improved SOI material by creating and

applying advanced metrology techniques to the evaluation of the material. NIST has

developed the capability of annealing SOI

wafers at the high (1350 °C) temperatures

required for fabricating the material and

has the capability to fabricate simple test structures on SOI. Analytical capabilities include advanced chemical-etching tech- niques combined with optical and electron microscopy and precision electronic measurements.

Contact:

Peter Roitman

(301) 975-2077

email: peter.roitman@nist.gov B310 Technology Building
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

METROLOGY FOR

MODELING AND

SIMULATION

Modeling and simulation activities cut

across the entire semiconductor industry.

Computer-aided design (CAD) continues to assume more importance as design cycle times become shorter and shorter and hard- ware prototypes become more and more

expensive to build. As more reliance is being

placed on computer-aided designs to be

accurate, the software models used in these designs also must be accurate and relevant

to the situations being simulated. The objectives of this project are to help ensure the accuracy and relevance of these models and

thus improve the efficiency and timeliness

of CAD and to increase the confidence that CAD users have in their designs. This is accomplished by developing and evaluating methods for measuring model parameters, developing methods to "validate" model per- formance and applicability, and supporting

the industry infrastructure for promulgating

these activities. The project's recent focus has been on model validation for high- power semiconductor devices and packages and for the system-level thermal perform- ance of microelectronic packages. Work

also is being initiated on metrology require- ments for semiconductor thermal process modeling.

Contact:

Allen R. Hefner, Jr. (301) 975-2071

email: allen.hefner@nist.gov B3 10 Technology Building

METROLOGY FOR

PROCESS AND TOOL

CONTROL

Integrated-circuit (IC) test structures, test- structure-based reference materials, and test methods developed by NIST are used widely

by the semiconductor industry and other government agencies. These devices can be used to characterize IC manufacturing

processes, to evaluate the effectiveness of semiconductor processing equipment, to obtain crucial parameters for process or circuit simulators, to perform product accep- tance tests, and to determine the reliability

of the products manufactured. NIST work

involves test-structure design, modeling,

data acquisition, and data analysis. Institute engineers are investigating pattern recognition techniques for the rapid diagnosis of

IC manufacturing processes. They also are developing new structures for nanometerlevel metrology and for establishing methods to determine the reliability of thin films used in state-of-the-art microcircuits.

Contact: Michael W. Cresswell

(301) 975-2072

email: michael.cresswell@nist.gov B360 Technology Building

INTERCONNECT

RELIABILITY

METROLOGY

Electrical interconnect reliability of inte- grated circuits continues to be a topic of

intense interest as evidenced by an increas- ing number of publications on the subject each year. This interest is the result of the planned aggressive scaling of integrated circuits and the need for ever greater reliability

as expressed in the National Technology

Roadmap for Semiconductors. A key under- pinning of efforts in this area is the develop- ment of the measurement tools and

standards to facilitate the goals of the industry. NIST researchers work with domestic

semiconductor manufacturers and others to develop new and improved test structures,

test methods, and diagnostic procedures for enhanced characterization and reliability of thin-film metal interconnects used in inte- grated circuits.

Advances in microelectronic circuit density, complexity, and reliability as well as greater demands for ever-shorter times to develop

and market new products are forcing the

U.S. semiconductor industry to use a new

approach to reliability. The traditional approach of using screen and accelerated

stress tests is becoming increasingly impractical to ensure the reliability of microelectronic products because too many parts and

too much time are required. NIST is working with the semiconductor industry to implement the new "building-in reliability approach," which emphasizes understanding and controlling the causes for reduced reliability.

Contact: Harry Schafft

(301) 975-2234

email: harry.schafft@nist.gov B360 Technology Building

DIELECTRIC RELIABILITY

METROLOGY

The U.S. semiconductor industry is aggressively scaling gate-oxide film thickness in microelectronic devices to achieve higher

chip performance and packing density. Reduced time to market and new oxide processes require fast and effective reliability characterization techniques. NIST, in col- laboration with the semiconductor industry,

is developing physically correct models and

tests to predict reliability of thin oxides under dc and ac operating conditions. Research is being performed to advance the understanding of time-dependent dielectric breakdown in thin Si02 films by verifying

the electric field dependence of the mechanism. High temperature is used to accelerate

dielectric failure so data can be obtained at lower electric fields in reasonable test times.
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

Current projects focus on the evaluation of

accelerated stress tests for predicting the long-term reliability of ultrathin dielectrics. The project also facilitates the development

of national standards for characterizing

dielectric integrity to help ensure consistent measurements among a company's multiple

manufacturing plants and between vendors and customers.

Contact: John S. Suehle

(301) 975-2247

email: john.suehle@nist.gov B360 Technology Building

MICROELECTROMECHANICAL SYSTEMS

Microelectromechanical systems (MEMS)

represent a rapidly growing segment of the

U.S. semiconductor industry' with a multibillion-dollar market expected to expand

10-fold over the next decade. This emerging

technology uses mechanical structures, made with integrated-circuit (IC) microfabrication techniques, to perform sensing and

actuation functions. Commercial applications for this technology include pressure

sensors, inertial sensors, fluid regulation and control, optical switching, mass data

storage, and chemical and biological sens- ing and control. Areas of interest include

standardization, environmental monitoring, and control in biomedical, military, and

space applications. Systems aspects address

the development of new circuits and process- ing techniques for monolithic integration of MEMS-based systems with new circuits for

control, communication, self-test, and selfcalibration functions. Standards aspects

address the need for test structures and test methods for measuring and understanding

the electromechanical properties and reliability aspects of these micromechanicalbased systems. Custom processing

techniques and incorporation of these tech- niques to post-processing of commercial

foundry-fabricated ICs are being developed and utilized for device fabrication.

Computer-aided design methods and standard libraries of device designs are being

developed for rapid commercialization and

technology transfer. Areas of specialization include microheating elements to produce

temperature-programmable surfaces for applications in thermal flat-panel displays and integrated gas analyzers and develop- ment of CMOS-based broad-band power

detectors for precision power measurement.

Contact: Michael Gaitan

(301) 975-2070

email: michael.gaitan@nist.gov B360 Technology Building

ELECTROMAGNETIC

FIELDS

Division Contact: Dennis Friday

(303) 497-3131

email: friday@boulder.nist.gov

fax: (303) 497-3122

Mailcode 813-00

Boulder, Colo. 80303-3328

www.boulder.nist.gov/div813

GUIDED-WAVE

MICROWAVE STANDARDS

AND MEASUREMENTS

The commercial and defense electronics

industries rely on microwaves for a variety

of applications, such as communications,

radar, navigation, and environmental monitoring. Microwaves are desirable because of

their high frequency and short wavelength.

The high frequencies allow for very wide

bandwidths, and the short wavelengths are important for reducing the size of components and devices. The accurate characterization of microwave devices and

components is critical to the design, develop- ment, testing, and performance of modern

microwave systems. The primary task of

device characterization at microwave fre- quencies consists of measuring the transmission or reflection response of a device to a known or controlled stimulus.

The principal quantities that characterize electromagnetic waves propagating in trans- mission lines or similar guided-wave structures are impedance, attenuation, scattering parameters, power, and noise. Rapidly devel- oping microwave technology requires the support of advanced measurement tech- niques and standards for these quantities. The microwave industry and the U.S. Depart- ment of Defense rely on NIST for calibrations of transfer standards to provide

accurate, traceable measurements required

for product development, performance evaluation, quality assurance, and commercial

interchangeability. To support international

traceability requirements, NIST compares its measurements of these quantities with those made by other national metrology institutes by participating in international comparisons coordinated by the International Bureau of Weights and Measures.

During the past decade, NIST researchers have developed six-port vector network analyzers (VNAs) for measuring scattering parameters, impedance, and attenuation. The six ports provide an independent measurement technique for verifying the accuracy of commercial VNAs. Calibration

services for scattering parameters, impedance, and attenuation are offered in popular

coaxial and waveguide sizes from 10 MHz to 100 GHz. NIST also supports the microwave

community by developing new measure- ment techniques and evaluating the accuracy of current techniques. Commercial

VNAs have become an indispensable tool for modern microwave measurements. NIST

currently is working on methods for assess- ing and for verifying the accuracy of vector network analyzers. As part of this effort, NIST administers a measurement comparison program with the Institute of Electrical
85 ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

and Electronics Engineers Automatic RF

Techniques Group that allows VNA users to compare their measurements with the measurements of others.

Microcalorimeters have been developed at NIST for the most accurate microwave

power measurements. NIST researchers have

developed both coaxial and waveguide

microwave calorimeters to characterize ther- mistor mounts. Thermistor mounts serve as reference standards for calibrating power

meters and other power measuring equip- ment. Present efforts are directed toward

developing coaxial power standards that will operate up to 50 gigahertz. Calibration services for coaxial and waveguide thermistor mounts are available from 10 megahertz to 100 gigahertz.

NIST does research on primary noise standards and radiometer systems to support

noise temperature and noise figure measurements. One port noise temperature is deter- mined by reference to a standard noise generator via a radiometer. Calibration services for measuring the thermal noise of coaxial and waveguide noise sources are available at limited frequencies from

30 MHz to 100 GHz. Researchers are developing an automated noise figure radiometer

that will operate over the frequency range from 1 GHz to 18 GHz. This system will measure the noise figure of active devices.

Contact: Robert M. Judish

(303) 497-3380

email: judish@boulder.nist.gov Mailcode 813.06

Boulder, Colo. 80303-332

HIGH-SPEED

MICROELECTRONICS

While the explosion of wireless applications

is fueling the demand for microwave and

radio-frequency microelectronics, advances

in the silicon industry continue to drive the

size of digital circuits down and their clock

rates up. These trends in the wireless and

digital industries have led to increasingly

stringent requirements for the electromagnetic characterization of monolithic micro- wave integrated circuits (MMICs), dense

multilayer interconnects, and other highspeed microelectronic structures. In response to these requirements, NIST

researchers are developing measurement

methods to characterize key, high-frequency

components and high-performance elec- tronic packages and interconnections.

NIST supports the industry through research and development of on-wafer metrology, particularly for the measurement of scattering, impedance, and noise parameters. Fabrication of co-planar and microstrip calibration standards is an important element in the

task. The project is supported by the NIST

Industrial MMIC Consortium, which provides close collaboration with industry in developing accurate and traceable on-wafer measurements.

The project aims for practical calibration and measurement methods that are suitable

for commercial laboratories. Methods are implemented in instrument control and

data processing software that interface with

a range of laboratory instruments, including

microwave network analyzers, radio- frequency network analyzers, and digital

sampling oscilloscopes. This range of options brings the advanced NIST technol- ogy into the hands of microwave, wireless, and digital engineers.

Contacts: Roger Marks

(303) 497-3037

email: marks@boulder.nist.gov

Dylan Williams

(303) 497-3138

email: dylan@boulder.nist.gov

Mailcode 813.06

Boulder, Colo. 80303-3328

ELECTROMAGNETIC

CHARACTERIZATION OF

MATERIALS

It is widely recognized that critical needs

exist for accurate data on the electromagnetic properties of certain materials used

extensively throughout the aerospace, microwave, electronics, and communications

industries. The electromagnetic properties of materials program at NIST seeks to support

industry by evaluating and improving meas- urement techniques, by providing well- characterized reference materials and measurement services, and by organizing measurement intercomparisons. Current

capabilities include room-temperature measurements of complex permittivity and per- meability for bulk materials in the spectral range, 100 kHz to 60 GHz, as well as highprecision cavity measurements of low-loss

dielectrics near 10 GHz. NIST is extending

its measurement capabilities, for both bulk and thin-film materials, into the millimeter range and at elevated and cryogenic

temperatures. Adequate and more accurate

materials characterization data will help

industry obtain optimal component and
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

system performance with greatly reduced

costs for corrective redesign.

Contacts: .Andrew G. Repjar

(303) 497-5703

email: repjar@boulder.nist.gov Claude M. Weil

(303) 497-5305

email: weil@boulder.nist.gov

Mailcode 813.08

Boulder, Colo. 80303-3328

ELECTROMAGNETIC

INTERFERENCE AND

COMPATIBILITY

NIST researchers are engaged in a wide

range of projects aimed at quantifying elec- tromagnetic interferences (EMI) and electro- magnetic compatibility (EMC). One thrust

of the NIST work is to develop measurement

techniques and methodologies for measuring emission of unintentional radiation from electronic devices. Another aspect under active investigation is the susceptibility of electronic equipment to such radiation. The researchers are identifying and

defining quantities that characterize the

susceptibility of a device and then developing methods to measure those quantities. Successful completion of this research should result in the development of standards and measurement techniques for EMI

and EMC that are meaningful, technically

practical, and reliable. These techniques then could be incorporated into voluntary

standards by both U.S. and international standards organizations.

Contact: Motohisa Kanda

(303) 497-5320

email: mkanda@boulder.nist.gov

Mailcode 813.07

Boulder, Colo. 80303-3328

ANTENNA

MEASUREMENTS

Researchers at NIST are developing reliable techniques and standards for measuring key

performance parameters of antennas and

components used with satellites, Earth terminals, radars, and communications systems.

Near-field scanning now is used routinely to characterize microwave and millimeter- wave antennas. NIST researchers are focus- ing on developing and implementing

techniques to correct for errors in the scan

surfaces and applying all near-field tech- niques to higher frequencies. Software for the analysis of spherical near-field data

recently has been rewritten and improved. Other research areas include spacecraft and

phased-array antenna measurements, antenna diagnostics using near-field tech- niques, and antenna systems measurements

using celestial radio sources.

Contacts: Andrew G. Repjar

(303) 497-5703

email: repjar@boulder.nist.gov

Carl F. Stubenrauch

(303) 497-3927

email: stubenrauch@boulder.nist.gov

Mailcode 813.08

Boulder, Colo. 80303-3328

ELECTROMAGNETIC

TECHNOLOGY

Division Contact: Richard E. Harris (303) 497-3776

email: harrisr@boulder.nist.gov

fax: (303) 497-3066

Mailcode 814.00

Boulder, Colo. 80303-3328

http://emtech.boulder.nist.gov

JOSEPHSON ARRAY

DEVELOPMENT

Manufacturers of precision electronic components and instrumentation need intrinsic

electrical standards at a level of accuracy above that achievable by traditional electrical metrology and artifact standards. The

characterization and calibration of modern

digital voltmeters, reference standards, and

analog-to-digital and digital-to-analog converters require the development of new and

improved intrinsic standards for the meas- urement of ac and dc voltage. Target cus- tomers are electronic instrument makers,

Department of Defense contractors, and

national and military standards laboratories.

The project pioneered the development of

practical Josephson voltage standards and, by encouraging the commercialization of

these standards, has allowed U.S. industry to dominate the world market for Josephson

voltage systems and components. Continuing work is designed to make these systems

faster, easier to use, and more reliable. The

project is developing a new generation of programmable voltage standards that can move rapidly to any specified output voltage.

Ultimately, the new standards should be fast enough to synthesize ac waveforms.

Contact:

Clark A. Hamilton

(303) 497-3740

email: hamilton@boulder.nist.gov

Mailcode 814.03

Boulder, Colo. 80303-3328
88 ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

NANOSCALE

CRYOELECTRONICS

Ultrasmall electronic devices operated at cryogenic temperatures offer unique capabilities that impact both fundamental

metrology and industrial instrumentation. This project is developing a device for accurately counting electrons that will provide a fundamental standard for capacitance and

allow an essentially new determination of

the fine-structure constant. Using ultrasmall (100-nanometer) tunnel junctions operated

at ultralow temperature (0.05 K), the device pumps electrons onto a capacitor one by one

at a rate determined by an external clock. This device will become metrologically

important when it is improved to the point where electrons are counted with an error

rate less than about 1 part in 10 .

Another cryogenic device under development

meets the need for an X-ray detector with

the improved energy resolution required for

precise X-ray microanalysis. Such an X-ray

detector, with an energy resolution of a few

electron volts, can be made using the rapid

change in resistance of a superconductor

near its transition temperature to sense the X-ray-induced temperature rise of electrons

in a normal metal film held at about 0.1 K. Such ultrasensitive thermometers offer enor- mous potential to materials analysis in the semiconductor and other industries and

promise remarkable advances for optical

detectors, high-energy physics, and analysis

of biological molecules.

Contact: Richard L. Kautz

(303) 497-3391

email: kautz@boulder.nist.gov Mailcode 814.03

Boulder, Colo. 80303-3328

HIGH-PERFORMANCE

SENSORS, INFRARED

DETECTORS, AND MIXERS

This project addresses the needs of users and

manufacturers of long-wavelength infrared

(IR) detectors. Precise radiometric calibration of such systems requires an improved

absolute cryogenic radiometer for blackbody and band-limited IR radiation with higher

accuracy and sensitivity than is presently

available. The physical foundation of the

project is the low noise and high sensitivity

of superconducting transition-edge ther- mometers. Use of a transition-edge detector

also is expected to improve the sensitivity of

the ac/dc thermal conversion measurements

by a factor of between 10 and 100 over room

temperature detectors. In addition, manufacturers and users of room-temperature

infrared imagers are seeking increased functionality from their systems. With support from the Department of Energy and a large commercial defense contractor, the project explores novel means of obtaining increased

functionality, such as antenna-coupling of IR detectors for polarization discrimination.

This project also explores the capabilities of very high-frequency diodes of various types,

particularly superconducting and roomtemperature metallic tunnel junctions. The

frequency agility provided by such highspeed diodes will be important to applications such as the wavelength-division

multiplexed telecommunications system in which very precise measurement and control of IR frequency is required. A further application for these devices is infrared

rectification for solar energy generation,

which, because it offers the possibility of

raising the efficiency beyond conventional

solar cells, is of great interest to the Depart- ment of Defense for size-constrained, powerstarved environments such as satellites.

Contact:

Erich N. Grossman

(303) 497-5102

email: grossman@boulder.nist.gov

Mailcode 814.03

Boulder, Colo. 80303-3328

SUPERCONDUCTOR

STANDARDS AND

TECHNOLOGY

Manufacturers of superconducting wire need

practical and accurate methods for characterizing critical current, ac loss, and other performance parameters. The unbiased

feedback of conductor performance and measurement considerations to U.S. manufacturers is important to maintain their competitive position in support of magnetic

resonance imaging, electric power, laboratory magnets, and other applications.

For Nb3Sn wires, the properties and handling of the sample mandrel can affect the measured critical current significantly. Sample damage, sample variability, and

mounting variability can have a major

effect on the measured critical current of high-temperature superconductors. This

project provides standards, measurement

techniques, quality assurance, reference

data, and clarification of issues for both

high- and low-temperature superconducting

wire technology. In conjunction with inter- national standards organizations, NIST

researchers develop standards for critical current and other parameter measurements,

conduct research, and lead interlaboratory i comparisons. They represent, update, and
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

seek input from U.S. industry throughout

the process of standards creation in order to

protect U.S. interests in international trade.

Contact: Loren F. Goodrich

(303) 497-3143

email: goodrich@boulder.nist.gov Mailcode 814.05

Boulder, Colo. 80303-3328

Recent developments in growth of high- energy physics accelerators and the deregulation of the electric power utilities have

resulted in demand for superconducting

magnets with both higher fields and larger

size. Both trends lead to higher magnetic

loading of the superconductor, which necessitates measurements of the effect of stress on electrical performance. The project instrumentation in the electromechanical

area is the only apparatus in the United

States for electrical transport measurements

of superconductors at high magnetic fields.

Contact: JackW. Ekin

(303) 497-5448

email: ekin@boulder.nist.gov Mailcode 814.05

Boulder, Colo. 80303-3328

HIGH-TEMPERATURE

SUPERCONDUCTING

ELECTRONICS

High-temperature superconductivity (HTS)

has opened the possibility for operating

superconducting electronic instrumentation

at temperatures accessible with present-day

cryocoolers. Low-temperature superconductors are used to produce unique standards, such as the Josephson volt, and measure- ment apparatus, such as superconducting

quantum interference devices. Equivalent

HTS devices would expand the applicability

of these devices far beyond standards and

research laboratories.

NIST scientists have developed fabrication,

testing capabilities, and theoretical competence for HTS devices in the areas of microwave and terahertz metrology and

technology. They work with the HTS communication industry to measure and improve

the power-handling capabilities of HTS

devices as well as to improve microwave measurement and characterization tech- niques for HTS films and devices. They also work with industry and other NIST divisions

to develop and test HTS bolometers for

calibrated radiometers, and they evaluate and improve HTS Josephson junctions for use in voltage standards, terahertz detectors, and other devices to meet the measurement

and application needs of industry.

Contact: David A. Rudman

(303) 497-5081

email: rudman@boulder.nist.gov

Mailcode 814.03

Boulder, Colo. 80303-3328

MAGNETIC RECORDING

METROLOGY

The magnetic recording industry is advancing rapidly the state of the art in highdensity information storage and read

devices. To maintain their competitive

advantage in rigid-disk manufacture, U.S. firms must constantly look to new properties

of magnetic materials. The accurate characterization of new materials often is beyond

the capability of the small companies most

eager to exploit them. Thus, NIST develops

metrology to assist the magnetic recording

industry and develops techniques to characterize the performance of ultrahigh-density

magnetic recording systems and of sub- micrometer magnetoresistive sensors.

NIST researchers have developed a scanning

micromagnetic recording system to characterize ultrahigh-density recording. The sys- tem combines the ability to read and write conventional bit tracks under a variety of controlled conditions with the ability to image the magnetic structure. It also allows

the characterization of advanced sensors without the need for full head fabrication. Development is coordinated with the needs

of commercial disk drive, head, and media

manufacturers as well as with the National

Storage Industry Consortium's heads pro- gram. The researchers develop micromagnetic models of magnetoresistive sensors

SUPERCONDUCTOR

INTERFACES AND

ELECTRICAL TRANSPORT

The high-temperature-superconductor

(HTS) industry needs high-quality contacts and interfaces for both thin-film and bulk

conductors. Industry has looked to NIST for engineering help and an understanding of how to control the surfaces of these new

materials. The new HTS materials also have

significant magnetic field anisotropy, which

has opened a new set of measurement and

modeling problems for conductor performance. Many of the companies that have

expressed a need for the expertise and the equipment available at NIST are small

start-up companies without extensive

infrastructure.

The thin-film fabrication equipment offers both sputter and laser-ablation deposition of HTS materials, reflection high-energy elec- tron diffraction analysis, in situ characterization of process gas and background

contaminants, ion-milling, and etching, all

in the same vacuum chamber. Equipment

to perform in situ scanning tunneling

microscopy surface analysis of HTS films allows surface conductivity maps to be made

immediately after film fabrication.
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

and media as well as characterization tech- niques for the new generation of subrai- crometer magnetoresistive sensors to be used

in ultrahigh-density magnetic recording.

Contact: David P. Pappas

(303) 497-3374

email: pappas@boulder.nist.gov

Mailcode 814.00

Boulder, Colo. 80303-3328

MAGNETIC INSTRUMENTS

AND MATERIALS

CHARACTERIZATION

Researchers, developers, producers, and

users of magnetic materials need tools for the accurate determination of magnetic

properties and the analytical interpretation

of data. Industries supported include: manufacturers of inductive recording heads, magnetoresistive read-back heads, thin-film and

particulate recording media, and magnetoresistive magnetic memories; producers

of microwave materials; companies

researching magnetoresistive sensors; superconductor wire manufacturers; and

magnetic-particle researchers in medicine. The project provides measurement services,

often in the form of collaborations, to

laboratories that do not have magnetic measurement and analysis capability.

NIST develops instruments, measurement

protocols, and theoretical models to characterize the magnetic properties of films, particles, and bulk solids as functions of magnetic field strength, field history, temperature, and time. Researchers develop, pro- mote, and transfer to industry magnetic

metrology for applications in magnetooptics, magnetic data storage, magnetochemistry, power conversion, and highfrequency electromagnetics.

Contact: Ron Goldfarb

(303) 497-3650

email: goldfarb@boulder.nist.gov Mailcode 814.05

Boulder, Colo. 80303-3328

NAN0PR0BE IMAGING

FOR MAGNETIC

TECHNOLOGY

Magnetic recording technology in 1997 was

a $33 billion worldwide industry for harddisk drives alone. The technology has advanced to where nanometer-scale morphological, magnetic, and electrical properties

play important roles in drive performance.

Images showing microroughness, device dimensions, magnetic field patterns, and

local electronic processes provide important

information about the fundamental operation and ultimate limitations of drive components. In addition, images of components

shipped for assembly can be used to deter- mine quality before manufacture of the complete drive. Scanning-probe microscopies

(SPM), such as scanning-tunneling, atomicforce, and magnetic-force microscopies, and

scanning potentiometry are uniquely qualified for many of these applications because

of the nanometer-scale dimensions of the various types of probes.

By working closely with industry', this project helps to determine which kinds of SPM

technology developed by the scientific community may have commercial impact. By

optimizing techniques for measurement, the researchers establish standard levels of instrument performance. They maintain an

active research program to develop new

imaging and image measurement tech- niques tailored to specific problems desig- nated by the magnetic recording industry.

Contact: John M. Moreland

(303) 497-3641

email: moreland@boulder.nist.gov

Mailcode 814.05

Boulder, Colo. 80303-3328

OPTOELECTRONICS

Division Contact: Gordon W. Day

(303) 497-5204

email: gwday@boulder.nist.gov

fax: (303) 497-7671

Mailcode 815.00

Boulder, Colo. 80303-3328

www.boulder.nist.gov/div815

LASER RADIOMETRY

NIST researchers develop measurement

methods and standards for characterizing

laser sources and detectors used primarily with continuous-wave radiation. They also develop and maintain measurement services

for laser power and energy, optical fiber power, and related parameters.

Accurate characterization of optoelectronic sources and detectors is crucial to the effective development and use of industrial technologies such as lightwave

telecommunications, laser-based medical

instrumentation, materials processing,

photolithography, data storage, and laser

safety equipment. The laser radiometry project focuses on selected critical parameters
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

intrinsic to optoelectronic sources and detectors, especially the calibration of optical

fiber power meters and laser power/energy

meters at commonly used wavelengths and

power levels. Absolute optical measurements

are traceable through high-accuracy cryo- genic electrical substitution radiometers to national electrical standards for power and

energy. In addition, special test measure- ments are available for linearity, spectral

responsivity, and spatial uniformity of optical power meters and detectors. In support

of source characterization, measurement

methods are developed to characterize beam

intensity profiles and propagation of laser beams. Project members participate in national and international standards committees developing standards for laser safety,

laser radiation measurements (such as beam profile and pointing stability), and

optical-power-related measurements. They

extend and improve source and detector characterizations through the development

of improved technology such as low-noise,

spectrally flat, highly uniform pyroelectric

detectors, solid-state light trapping detectors, deep ultra-violet optical calorimeters, and new tunable-wavelength laser systems.

Contact: Christopher L. Cromer

(303) 497-5620

email: cromer@boulder.nist.gov

Mailcode 815.01

Boulder, Colo. 80303-3328

High-bandwidth measurements are needed

to support high-performance systems that take advantage of the potential bandwidth of

optical fiber. Systems presently being

installed operate at 5 gigabits per second to 10 gigabits per second using pure optical time division multiplexing (OTDM);

research is being conducted on the next generation of OTDM systems at 20 gigabits per second to 40 gigabits per second. Increasingly tight tolerances in both digital and

analog systems require frequency response measurements with low uncertainty.

Project members use both frequencydomain and time-domain techniques to characterize the modulation response of optoelectronic components with the low

uncertainty, large frequency range (over 5 decades), and fine frequency resolution required by international standards for present and future optoelectronic systems. Source and detector noise measurements are required to predict low-bit error ratios in computer interconnects, high carrier-tonoise ratios in analog systems, and to support erbium-doped fiber amplifier noisefigure measurements using electrical noise measurement methods. Intensive use of

laser target designators by the armed forces

requires traceable, low-level pulse power and energy calibration standards at 1.06 micrometers and 1.55 micrometers.

Contact: Paul D. Hale

(303) 497-5367

email: hale@boulder.nist.gov Mailcode 815.01

Boulder, Colo. 80303-3328

FIBER-OPTIC

METROLOGY

Optical fibers largely have replaced coaxial

cable in long-distance telecommunications

systems and rapidly are being installed in

local-area applications. NIST staff interact

with industry groups to develop measure- ment methods and reference standards for

the characterization of these components.

The joining of optical fibers requires the

fiber to have accurately controlled dimensions. NIST-developed Standard Reference

Materials for cladding diameter allow manufacturers to calibrate instrumentation used

in manufacturing and quality control; geo- metrical standards for fiber coatings and

connector ferrules have been developed as

well. Dispersion, the variation of propagation velocity with wavelength or polarization, sets the limit for the rate at which

information can be transmitted. Measure- ment methods and standards for chromatic

dispersion are available, and polarizationmode dispersion standards currently are under development.

The development of optical amplifiers has brought revolutionary changes to the design

of communications. Since these new components require special methods of characterization, measurement services for spectral gain and noise figure are now in develop- ment. Non-linear properties of fiber, such as four-wave mixing and soliton effects, have

been studied and applied to instrumentation. Novel implementations of reflec- tometry in fiber also are being studied.

Project staff develop advanced measurement

methods and Standard Reference Materials

for optical fibers and interact with standards groups to provide a metrology base for the lightwave communication industry.

Contact: Paul Williams

(303) 497-3805

email: pwilliam@boulder.nist.gov Mailcode 815.02

Boulder, Colo. 80303-3328

HIGH-SPEED

OPTOELECTRONIC

MEASUREMENTS

NIST provides advanced metrology and

standards relating to temporal properties of

optical sources and detectors used with

optoelectronic systems. Researchers also develop and maintain measurement services

for optoelectronic frequency response, impulse response, relative intensity noise, noise figure, and low-level pulsed energy.
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

INTEGRATED OPTIC

METROLOGY

Optical waveguides in planar geometries,

often called integrated optics, are increasingly used in communications and other

optoelectronic systems. This project develops advanced measurement methods for inte- grated optical waveguides and interacts with standards groups to provide a metrology

base for the lightwave communications

industry. As the optical communications

industry moves toward local-area networks and toward fiber to the home, there is increasing need for inexpensive passive components, such as splitters. Additionally, such components are needed because longdistance telephony is retrofitting to wavelength-division multiplexing (WDM).

Several companies are manufacturing 1 x N

splitters or are about to market them; in

addition, arrayed waveguide gratings and

other devices in integrated optics are giving

rise to multiplexers for dense WDM. There

are, however, no standard measurement

procedures similar to those for fiber-index

profile and mode-field diameter. Nor are

there artifact standards similar to those for

fiber geometry. It also is not obvious how to perform analogous measurements when the mode field pattern of an integrated optical waveguide is not circularly symmetric or when the fiber measurement is performed

using a cutback technique or a mandrel

wrap. Thus, several critical measurements

are under examination.

Contact: Matt Young

(303) 497-3223

email: myoung@boulder.nist.gov

Mailcode 815.02

Boulder, Colo. 80303-3328

OPTICAL FIBER SENSORS

The NIST optical fiber sensors project supports the sensor industry broadly by providing measurements and standards for the characterization of optical materials and components used in sensors. Researchers

also develop and evaluate new fiber optic sensors for other government agencies and

industry. Most of the work has been devoted

to high-sensitivity, high-bandwidth electric current and magnetic field sensing,

although recent work has involved other measurands. A broad range of research and

development is performed, including trans- ducer, component, systems, and materials work. When possible, newly developed sensor technology is transferred to interested U.S. companies. A successful example involves annealed fiber coil technology that creates

stable current sensors out of common optical fiber and now is available commercially.

In collaboration with U.S. companies, NIST

developed a Standard Reference Material for

optical retardance. The device, based on

Fresnel rhombs, has nominally 90-degree

retardance at 1.3 micrometers with 0.1- degree stability over wide ranges of wavelength, angle, and temperature. In addition

to the Standard Reference Material, special measurement services for retardance using

the accurate methods developed at NIST are

offered. NIST researchers also are collaborat- ing with industry to develop measurements

that support optical data storage. Efforts now focus on substrate characterization, with the goal of providing materials that improve the calibration of disc birefringence

testers.

Contact:

Kent B. Rochford

(303) 497-5170

email: rochford@boulder.nist.gov Mailcode 815.03

Boulder, Colo. 80303-3328

FIBER AND DISCRETE

COMPONENTS

Advanced optical communications systems

use many different types of components to control and modify propagating signals. NIST develops measurement technology to characterize these components and understand their limits.

This project currently is conducting

research on polarization-dependent loss and gain metrology, characterization of photo-induced Bragg fiber gratings, and

wavelength standards for optical fiber communications. Polarization-dependent loss and gain in components affect a system's performance, especially when many components are in the system. NIST is developing a polarization-dependent loss calibration standard for commercial test instruments and is characterizing polarizationdependent gain of fiber amplifiers. Photo- induced Bragg gratings in optical fiber are

likely to be incorporated in fiber lasers, dispersion compensators, and filters. The

researchers evaluate the growth characteristics and long-term stability of these

fiber gratings. They also are developing Standard Reference Material absorption

cells for wavelength calibration in the 1.5 micrometer region. These cells can be used

to calibrate the instruments that characterize the spectrum of sources and wavelength dependence of components. This

calibration capability will become increasingly important as wavelength-division

multiplexing optical communication

systems are implemented.

Contact: Sarah L. Gilbert

(303) 497-3120

email: sgilbert@boulder.nist.gov Mailcode 815.03

Boulder, Colo. 80303-3328
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

DIELECTRIC MATERIALS

AND DEVICES

NIST is developing measurement methods and acquiring critical data to improve the manufacturing of dielectric optical devices and materials. This work supports eventual and current commercial applications requiring passive optical components, electrooptic and non-linear devices, and compact

solid-state lasers. Research activities include developing rapid non-destructive evaluation methods for bulk and thin-film ferroelectric materials such as lithium niobate, lithium

tantalate, potassium titanyl phosphate, and

non-linear polymers. Domain-engineered

geometries of these materials also are under

investigation. Commercial application of

this work supports device and product devel- opment for optical data storage, biomedical

lasers, vehicle navigation, and optical communications. NIST also is improving methods for the manufacture of compact

rare-earth-doped solid-state waveguide

lasers and amplifiers. This effort currently is emphasizing neodymium-. erbium-, and

ytterbium-doped silicate and phosphate

glasses. Critical measurements include

evaluation of the dopant concentration profiles that define waveguides and spectroscopic properties such as lifetimes and cross

sections. Rigorous numerical modeling is

i leading to optimized designs of mode-

' locked lasers, Q-switched lasers, and

optical amplifiers. Various pulsed,

continuous-wave, branched, and narrowline lasers have been developed, including

[ distributed Bragg-reflector lasers. Commercial applications include sensors and optical telecommunications.

Contact: Norman A. Sanford

(303) 497-5239

. email: sanford@boulder.nist.gov

Mailcode 815.04

Boulder, Colo. 80303-3328

SEMICONDUCTOR

MATERIALS AND DEVICES

The commercial success of semiconductor

optoelectronic devices in an ever-widening

array of applications (telecommunications,

computer interconnects, data storage, display, printing, and sensor systems) requires low-cost manufacturing. NIST scientists develop measurement tools suitable for crucial stages in the manufacture of compound

semiconductor devices such as light- emitting diodes, diode lasers, detectors, and

modulators. The operation of key devices depends critically on the thickness and compositional uniformity of epitaxial layers. To

increase device yield, NIST is improving optical methods for the in-process monitoring

and control of semiconductor layer deposition. NIST researchers use computer simulations and the correlation of data from

several in-situ and ex-situ techniques to improve the measurements' accuracy. Test

structures and novel measurement tech- niques have been developed to measure precisely optical constants, defect diffusion, and

quantum microcavity effects. Researchers

fabricate semiconductor quantum-well

devices used in laser and detector metrology

and sensing applications. Ultra-short pulse measurements are applied to semiconductor

materials characterization and the fabrication and characterization of high-speed

devices. In support of next-generation data communications, display, and data storage

products, NIST scientists are measuring and

modeling the properties of vertical-cavity surface-emitting lasers.

Contact: Robert K. Hickernell

(303) 497-3455

email: bobhick@boulder.nist.gov Mailcode 815.04

Boulder, Colo. 80303-3328

RESEARCH

FACILITIES

SEMICONDUCTOR

PROCESSING

LABORATORY

As integrated circuit (IC) sizes increase to more than 1 cm and feature sizes within

the circuits decrease to less than 1 \im,

critical demands are placed on the measure- ment capability required to control and

monitor IC fabrication successfully. To meet

the demand, NIST researchers are developing state-of-the-art measurement proce- dures for microelectronics manufacturing.

The Semiconductor Processing Laboratory

provides a quality physical environment for a variety of research projects in semiconductor microelectronics as well as in other

areas of physics, chemistry, and materials

research. The laboratory facilities are used

for projects addressing many areas of semi- conductor materials and processes, includ- ing process control and metrology, materials

characterization, and the use of integrated

circuit materials and processes for novel

applications.

The laboratory complex occupies about 372 m

2

, approximately half of which is composed of clean rooms. Within the clean rooms, work areas are maintained at class

30. The facility is designed so the work areas can be modified easily to accommodate the frequent equipment and other changes

required by research.

CAPABILITIES The laboratory has a complete capability for

IC fabrication. Principal processing and

analytical equipment is listed below.

• Diffusion, Oxidation, and Annealing.

Six furnace tubes for up to 75-millimeter- diameter wafers and five tubes for up to 100-millimeter-diameter wafers.
g4

ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

• Photolithography. Research mask aligner

(proximity and contact) for wafers up to 100 mm in diameter and irregularly shaped

samples and 10 x direct-step-on wafer

system for 75-millimeter-diameter wafers.

Photoresist spin coating and developing and

related chemical processing, including oxy- gen plasma stripping. E-beam writing and

scanning electron microscope exam-ination

of small features on 75-millimeter wafers.

• Film Deposition. Low-pressure chemical

vapor deposition systems for depositing

silicon nitride, polysilicon, and low- temperature silicon dioxide. Radio fre- quency and dc vacuum sputtering of metals and dielectrics. Electron beam and hot fila- ment vacuum evaporation of metals.

• Etching. Wet and dry etching processes. Plasma barrel etching of nitride films and wet chemical etching of silicon for micromachining.

• Ion Implantation. Multipurpose 200 keV

ion implanter.

• Analytical Measurements. Thin-film

reflectometry and other thickness measurements, optical microscopy, and grooving and staining.

• In-Situ Metrology. In-situ, real-time, multiple wavelength ellipsometry to measure optical constants of silicon and other chemical vapor deposition materials such as

silicon dioxide, polysilicon, and silicon

nitride.

APPLICATIONS Small quantities of specialized semiconductor test specimens, experimental samples,

prototype devices, and processed materials can be produced. The processes and process- ing equipment can be monitored during

operation to study the process chemistry and

physics. The effects of variations in operat- ing conditions and process gases and chemical purities can be investigated. Research is performed under well-controlled conditions.

A research-oriented facility, the laboratory is not designed to produce large-scale ICs or similar complex structures. Rather, the laboratory emphasizes breadth and flexibility to support a wide variety of projects.

Currently, research projects address many

aspects of microelectronic processing steps and materials as well as silicon micro- machining. Examples include: metal- oxide-semiconductor measurements; metalsemiconductor-specific contact resistivity; uniformity of resistivity, ion-implanted

dopant density, surface potential, and inter- face state density; characterization of deposited insulating films on silicon carbide; ionization and activation of ion-implanted

species in semiconductors as a function of annealing temperature; electrical tech- niques for dopant profiling and leakage current measurements; and processing effects on silicon-on-insulator materials. A simple

CMOS process has been established.

AVAILABILITY Laboratory staff welcome collaborative research projects consistent with the research goals of the NIST semiconductor

program. Work is performed in cooperation

with the technical staff of the laboratory.

The most productive arrangements begin

with development of a research plan with

specific goals. The commitment of knowledgeable researchers to work closely with NIST staff and the provision of equipment

and other needed resources are required. Because hazardous materials are present, laboratory staff must supervise all research

activities.

Contact: Donald B. Novotny

(301) 975-2699

email: donald.novotny@nist.gov B310 Technology Building

MOLECULAR-BEAM

EPITAXY FACILITY

Molecular-beam epitaxy (MBE) of III-V semiconductors is used to fabricate heterostructures with highly controlled electrical,

optical, and structural properties. The facility's primary role is to study and measure

material parameters of advanced compound

semiconductors, especially in ways that pro- mote new and improved measurement tech- niques. The MBE facility is equipped with a dual-chamber MBE system. One chamber is devoted to the fabrication of heterostructures for research and metrology. This effort includes high-mobility modulation-doped

field-effect transistors, quantum Hall

devices, self electro-optical effect devices,

superlattices, lasers, and optical modulators. The adjoining chamber is a state-of-the-art MBE for developing and performing in-situ metrology of advanced semiconductors. What distinguishes this effort from others is the availability of numerous in-situ probes

that can simultaneously measure the same

materials parameters over a wide range of temperatures. This will lead to a better understanding of the limitations of an indi- vidual probe and will provide industrial manufacturers with important correlations they can use for improved growth control.

Contact: Joseph G. Pellegrino

(301) 975-2123

email: joseph.pellegrino@nist.gov A305 Technology Building

WAFER PROBING

LABORATORY

The NIST Wafer Probing Laboratory provides

the capability for automated dc probing of

test devices on up to 200-millimeter wafers. The system consists of a state-of-the-art commercial parameter analysis test system

upgraded with a nanovolt digital multimeter

controlled by a workstation. A computercontrolled 200-millimeter wafer prober
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

allows for fast wafer mapping of devices. A

switching matrix allows for the use of up to 36 independent connections; these may go

either directly to a probe card for wafer probing or, through use of adapter boards,

directly to packaged parts. Currently, the Wafer Probing Laboratory is primarily used

in the development and evaluation of test structures for very large-scale integration for metrology applications; the system also is capable of measuring the dc characteristics

of devices such as transistors. Additional equipment in the Wafer Probing Laboratory

includes a 125-millimeter manual wafer

probe station and inspection microscopes. This facility is available in support of col- laborative research with NIST.

Contact: Richard A. Allen

(301) 975-5026

email: richard.allen@nist.gov B360 Technology Building

MODE-STIRRED

CHAMBERS

NIST researchers have designed and constructed mode-stirred (reverberating) chambers to measure radiated electromagnetic

emission, immunity of electronic equip- ment, and shielding effectiveness of materials and cable/connector assemblies. A

mode-stirred chamber is an electrically large (in terms of wavelength), high-quality

cavity whose boundary conditions are varied by means of a rotating conductive tuner.

. CAPABILITIES The mode-stirred chamber simulates nearfield conditions for tests at frequencies from

200 MHz to 40 GHz. Equipment as large as

1.5 m x 2.0 m x 3.0 m can be tested in highlevel test fields up to 1000 V/m.

APPLICATIONS

In addition to performing radiated-emission

or immunity measurements of electronic equipment, the mode-stirred chambers can measure the shielding effectiveness of gasketing, composites, and other materials used

for radio-frequency shielding applications.

The chambers also can be used to measure

the shielding effectiveness of wiring harnesses, printed circuit boards, and connector

assemblies. To perform faster immunity

measurements, NIST researchers are studying frequency stirring as an alternative to mechanical stirring. Preliminary data indi- cate that good field uniformity can be obtained by using bandwidths on the order

of 10 MHz.

AVAILABILITY Two chambers are available. NIST staff are available for collaborative programs or to advise and interpret measurement results.

Contact: Motohisa Kanda

(303) 497-5320

email: mkanda@boulder.nist.gov

Mailcode 813.07

Boulder, Colo. 80303-3328

GROUND SCREEN

ANTENNA RANGE

The ground screen antenna is an open area

test site.

CAPABILITIES The ground screen consists of 6.35- millimeter mesh galvanized hardware cloth

stretched over a level concrete slab. The

screen is 30.5 m wide by 6l m long and

permits far-field measurements in the highfrequency portion of the spectrum. The

mesh dimension provides for an efficient ground plane well into the ultrahigh fre- quency part of the electromagnetic spectrum.

APPLICATIONS The range can be used for the following

applications:

• antenna calibrations,

• antenna patterns at any polarization,

• electromagnetic immunity measurements,

• electromagnetic radiated emission measurements,

• calibration of field intensity meters, and

• wave propagation studies.

AVAILABILITY This facility is used heavily in performing

calibrations for industry and other govern- mental agencies. It is available for inde- pendent or collaborative work.

Contact: Motohisa Kanda

(303) 497-5320

email: mkanda@boulder.nist.gov

Mailcode 813.07

Boulder, Colo. 80303-3328

TRANSVERSE

ELECTROMAGNETIC

CELL

NIST researchers have designed and constructed several transverse electromagnetic

(TEM) cells that are available for use. A TEM cell is an enclosure for performing

radiated electromagnetic emission and

susceptibility measurements of electronic equipment. Its design is based on the concept of an expanded transmission line oper- ated in a TEM mode.

CAPABILITIES The cell provides a shielded environment for

testing without introducing multiple reflections experienced with the conventional

shielded enclosure. It simulates very closely a planar far field in free space and has

constant amplitude and linear phase

characteristics.
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

APPLICATIONS

In addition to radiated electromagnetic

interference testing, other applications of the TEM cells include the calibration of antennas and the study of biological effects of radio-frequency radiation.

AVAILABILITY

Several TEM cells with five different sizes and five upper frequency limits in the 100 MHz to 1 GHz frequency range are available. In collaborative programs, NIST staff are available to advise and interpret measure- ment results. Independent testing also can

be arranged.

Contact: Motohisa Kanda

(303) 497-5320

email: mkanda@boulder.nist.gov

Mailcode 813.07

Boulder, Colo. 80303-3328

ELECTROMAGNETIC

ANECHOIC CHAMBER

The electromagnetic (EM) anechoic chamber at NIST is a facility for generating standard, well-characterized electromagnetic

fields. Such fields are fundamental to the

research, development, and evaluation of antennas, field probes, and EM material

properties.

CAPABILITIES EM fields up to 100 V/m can be established

in the chamber over the broad frequency range from 200 MHz to 40 GHz and up to 200 V/m for certain bands above 1 GHz. A

majority of the individual components composing the measurement system are under computer control, thus enhancing statistical control of the measurements. The chamber

measures 8.5 m x 6.7 m x 4.9 m.

APPLICATIONS The EM chamber is used in areas such as:

• research, development, and evaluation of new EM-field-generation and measurement

methods;

• calibration of field measurement

instruments;

• immunity testing of electronic equipment;

• shielding effectiveness and material parameter studies; and

• special tests for industry, government

agencies, and universities.

AVAILABILITY This facility is used heavily in performing

calibrations for industry and other govern- mental agencies. It is available for inde- pendent or collaborative work with NIST.

Contact: Motohisa Kanda

(303) 497-5320

email: mkanda@boulder.nist.gov

Mailcode 813.07

Boulder, Colo. 80303-3328

CONCENTRIC LOOP

ANTENNA SYSTEMS

NIST researchers have developed an

antenna system consisting of three concentric, orthogonal metal loops, each having

two diametrically opposed gaps. Analog sig- nals from the gaps are relayed to processing

electronics by fiber-optic links in order to prevent distortion of the measured fields by

electrical conductors. The signals are combined to give both the electric and magnetic

components of an incident field.

CAPABILITIES The present system consists of 1 -meter- diameter loops, which are usable from 3 kHz

to 100 MHz. The frequency range can be

shifted upward by using smaller diameter

loops. The minimum detectable power radi- ated from a device near the center of the loops ranges from 0.1 fW at 10 MHz to 1 pW

at 100 MHz, with a 1 Hz noise bandwidth. The system has a dynamic range of 100 dB.

APPLICATIONS Loop antenna systems can be used for:

• measurements of total E and H emissions from electronic devices such as video display terminals (VDT) that are placed near the center of the three loops;

• determination of the Poynting vector from incident plane waves;

• near-field measurements of power radi- ated from strong sources used in electromagnetic interference and electromagnetic pulse

testing; and

• measurement of field levels near large conducting structures where plane wave

approximations are not valid.

AVAILABILITY The present 1 -meter-diameter system is being used as a research tool to develop standard measurement techniques for emissions from VDTs. It is available for collaborative work in this or other areas of potential

usefulness. Loops with other diameters or

special requirements could be fabricated by

special arrangement.

Contact: Motohisa Kanda

(303) 497-5320

email: mkanda@boulder.nist.gov

Mailcode 813.07

Boulder, Colo. 80303-3328
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

STANDARD TRANSIENT/

IMPULSIVE FIELD

FACILITY

This facility is designed to generate and

transmit standard transient fields. The sys- tem consists of a 30-square-meter ground

plane and a 3-meter conical transmitter. The input signal is transmitted as a welldefined spherically expanding wave that can

be used to evaluate the impulse response of electromagnetic probes and sensors.

CAPABILITIES The transmit capabilities are primarily limited by the output spectrum and amplitude

of the input signal source. In-house sources allow measurements of frequency components between 50 MHz and 10 GHz, and field

levels of up to 100 VVm. The transmitted wave is known to an accuracy of ± 1 dB.

APPLICATIONS The primary use for this facility is the cali- bration of broadband probes and sensors. Other applications are measuring the shield- ing effectiveness of structures and walls and

measuring the immunity of electronic

devices and equipment to transient electro- magnetic fields.

AVAILABILITY This facility is available for calibration of broadband devices. Other applications are

possible on a limited basis. Tests requiring

higher frequencies or field levels are possible with special arrangements.

Contact: Motohisa Kanda

(303) 497-5320

email: mkanda@boulder.nist.gov

Mailcode 813.07

Boulder, Colo. 80303-3328

MOBILE TRANSIENT INTEGRATED-CIRCUIT

RECEPTION/TRANSMISSION FABRICATION

SYSTEM LABORATORY

Several broadband antennas are available

for transmission and reception of transient

signals. By combining these antennas, broadband transient generators, high-speed

transient digitizers, and sophisticated signal

processing, a variety of measurements are

possible.

CAPABILITIES The capabilities are related closely to the

desired application. With existing antennas,

it is possible to transmit transient signals with spectral components from 25 MHz up

to 14 GHz and field amplitudes of greater than 200 V/m. Receiving antennas have

similar frequency restrictions and sensitivities determined by the receiving equipment.

Sensitivities of better than 500 V/m are

typical.

APPLICATIONS

This system has been applied in a wide variety of diverse applications, and many more

are possible. Some of the specific applications are measurement of the shielding effectiveness of materials, automobiles, and

aircraft; non-invasive evaluation of electrical properties of materials; reflectivity of

dissipative macrostructures, such as radio- frequency absorber and ferrite tiles; evaluation of reverberation and anechoic chamber performance; and measurement of

fields radiated from electrostatic discharges.

AVAILABILITY This system is readily available for interesting applications. Higher frequencies, amplitudes, and greater sensitivities are possible but require fabrication of special antennas.

Contact: Motohisa Kanda

(303) 497-5320

email: mkanda@boulder.nist.gov

Mailcode 813.07

Boulder, Colo. 80303-3328

NIST maintains a complete fabrication laboratory for superconducting integrated circuits. Devices employing both low- and

high-temperature superconductors are supported. Demonstrated capabilities include

the fabrication of 20,000-j unction Josephson

10-volt array standards using niobium

trilayer technology. The laboratory is housed in an M2.5/3-5 (Class 100/1000)

ciean room. Individual facilities include a

digital pattern generator, submicrometer

resolution waferstepper, precision contact

aligner, laboratory-scale electron-beam

lithography system, pulsed laser deposition

system, metal and insulator thin-film deposition and etching systems, and requisite accompanying processing tools. Silicon wafer processing facilities for microelectro- mechanical system fabrication include

oxidation, diffusion, silicon nitride growth,

polysilicon growth, and low-temperature

doped oxide growth. These facilities are available on a limited basis in support of collaborative research with NIST.

Contact: James A. Beall

(303) 497-5989

email: beall@boulder.nist.gov Mailcode 814.03

Boulder, Colo. 80303-3328

ULTRALOW-TEMPERATURE

ELECTRONICS FACILITY

A H

3/H

4 dilution refrigerator provides an

approximately 20 mK low-temperature envi- ronment for ultrasensitive measurement systems. Two projects using this system are integrated circuits incorporating ultrasmall metal tunnel junctions for counting single

electrons and a record-setting X-ray detector having superior energy resolution and speed
ELECTRONICS AND ELECTRICAL ENGINEERING LABORATORY

compared with any other detector. The facility is remarkable for its shielding from exter- nal radiation, including that from thermal

sources at temperatures higher than its own.

Contact: John Martinis

(303) 497-3597

email: martinis@boulder.nist.gov Mailcode 814.03

Boulder, Colo. 80303-3328

NEAR-FIELD SCANNING

FACILITY FOR ANTENNA

MEASUREMENTS

This automated facility is designed to measure the near-zone phase and amplitude distributions of the fields radiated from an antenna under test. Mathematical transfor- mations are used to calculate the desired antenna characteristics.

CAPABILITIES

Near-field data can be obtained over planar,

cylindrical, and spherical surfaces; the pla- nar technique is the most popular. Efficient computer programs are available for process- ing the large quantities of data required.

When operated in the planar mode, the facility is capable of measuring over a 4.5 m x

4.5 m area with probe position errors of less than ±0.01 cm. Improved position accuracy

is possible with further alignment, especially over smaller areas. Antennas with apertures up to about 3 m in diameter can be measured with a single scan. The facility has been used successfully over the frequency range 750 MHz to 75 GHz. It incorporates

provisions for scanning larger antennas in segments.

APPLICATIONS • Antenna Characteristics. The facility is used primarily for determining the gain, pattern, and polarization of antennas. Accuracies are typically ±0.15 dB for absolute gain

and ±0.10 dB/dB for polarization axial

ratio. Patterns can be obtained down to the -50 dB to -60 dB levels with side lobe accuracy typically about ±1.0 dB at the 40 dB

level. (The exact uncertainties depend on

the frequency, type, size of antenna, and

other factors.) Near-field data also can be used to compute near-field interactions (such as mutual coupling) of antennas and

radiated field distributions in the near zone.

• Antenna Diagnostics. Near-field scanning

is also a valuable tool for identifying prob- lems and for achieving optimal performance

of various types of antenna systems. It has been used to advantage in locating faulty elements in phased-array antennas and for adjusting feed systems to obtain the proper

illumination function at the main reflector. Phase contour plots of the near-field data

also can be used to determine surface imperfections in reflectors used for antennas or compact ranges.

• Probe Calibrations. A spherical probe cali- bration facility serves as a far-field range for measuring the receiving characteristics of probes used to obtain near-field data. These measurements are required to determine the probe coefficients, which, in turn, are used

to calculate accurate, probe-corrected, farfield gain and pattern characteristics of an

antenna.

AVAILABILITY Two kinds of arrangements can be made to use this facility. NIST staff can perform

specified tests or measurements on a reimbursable basis. In this case, the customer

has no direct use of the facility; all measure- ments are performed by NIST staff, and the customer is issued a test report. As an alternative, work may be performed on a cooperative basis with NIST staff. This arrangement

permits the user the advantage of developing

firsthand knowledge of the measurement

processes, and the user is responsible in

large part for the accuracy of test results. In

either case, arrangements need to be made

well in advance, and reimbursement is required for the facility use and time of NIST staff involved.

Contact: Andrew G. Repjar

(303) 497-5703

email: repjar@boulder.nist.gov Mailcode 813.08

Boulder, Colo. 80303-3328

MAGNETIC THIN-FILM

FABRICATION AND

IMAGING FACILITY

NIST maintains a magnetics fabrication and

characterization facility. The fabrication

facility provides vacuum deposition of lay- ered magnetic thin films, including materials that exhibit giant magnetoresistive

behavior. Instrumentation includes several

varieties of scanned probe microscopies such

as the magnetic force microscope, magnetic

resonance force microscope, and scanning

near-field magneto-optic microscope. Other

instrumentation includes an ac susceptometer, a Kerr optical analysis platform, a super- conducting quantum interference device magnetometer, and a vibrating sample

magnetometer.

Contacts: Stephen Russek

(303) 497-5097

email: russek@boulder.nist.gov John Moreland

(303) 497-3641

email: moreland@boulder.nist.gov

Mailcode 814.05

Boulder, Colo. 80303-3328
INFORMATION TECHNOLOGY

LABORATORY

About 60 percent of all U.S. workers have

jobs that depend on the information they generate and receive on advanced infor- mation networks. Innovations in computer hardware, software, and digital communications will challenge managers to apply new technology for productivity increases throughout the American

economy in the coming years and will have pervasive effects on industry struc- ture as well as on the quality of govern- ment services. Also, since computers will be distributed throughout society, both at home and in the workplace, computer

integration, interoperability , usability,

reliability, and security will become even more important.

N'IST's Information Technology Laboratory (ITL) concentrates on developing

tests and test methods for information

technologies that are still in the early

stages of development—long before they

are available in new products. But even once information technology products are

available, tests developed by ITL provide

impartial ways of measuring them so developers and users can evaluate how

products perform and assess their quality based on objective criteria.

Technical research, industry collaborations, and standards-related work of the ITL address issues emerging from today's information revolution.

Contact: Shukri Wakid, Director (301) 975-2900

email: swakid@nist.gov

fax: (301) 840-1357 B263 Technology Building

www.nist.gov/itl

COOPERATIVE RESEARCH

OPPORTUNITIES

Software Diagnostics and Conformance

Testing

99 Software Quality 100 Conformance Testing

1 00 Future Standards for Software 100 Geographic Information Systems

Computer Security

100 Security Technology

1 01 Systems and Network Security

Advanced Network Technologies

101 High-Speed Networks

101 Multimedia and Digital Video 102 Next-Generation Internet

Human-Computer Interface Technologies

102 Spoken Language Technology 102 Text Search and Retrieval

103 Visual Image Processing 103 Information Visualization

Mathematical and Computational

Sciences

103 Mathematical Modeling 104 Mathematical Software 104 Optimization and Computational

Geometry 104 Image Compression

Statistical Engineering

105 Collaborative Research and Development

105 Measurement Process Evaluation

High-Performance Systems and Services

106 Scientific Visualization

106 Continual Upgrades

107 Parallel Computing

1 07 Performance of Modern-Architecture Computers

107 Information Storage and Interconnect Systems

RESEARCH FACILITIES

108 Computer and Network Security Facility

108 Advanced Network Facility

COOPERATIVE RESEARCH

OPPORTUNITIES

SOFTWARE DIAGNOSTICS

AND CONFORMANCE

TESTING

Division Contact: Mark W. Skall (301) 975-3262

email: mark.skall@nist.gov

fax: (301) 948-6213

562 NIST North

www.itl.nist.gov/div897

SOFTWARE QUALITY

Growing dependence on computers requires assurance that critical systems will operate

reliably and exactly as intended without

adverse effects, even when outside circumstances cause other systems to fail. NIST

researchers are developing tools and methods for analysis and testing of high-integrity

software. Static analysis tools to reduce

errors in software development and mainte- nance include Unravel, a program-slicing

tool for analyzing changes to C language

source code. A reference implementation of role-based access control for World Wide Web

servers is being developed as well. To allow

software developers to measure the effective- ness of development techniques, and compare their results with others, a unique

database of software errors, faults, and fail- ures is being developed. Formal methods are being used to improve the precision of soft- ware specifications, standards, and tests. In

addition to developing the first formal model

for role-based access control, researchers are using formal methods for automated generation of tests for specifications. An online
00 INFORMATION TECHNOLOGY LABORATORY

collection of papers and software can be found at http://hissa.nist.gov.

Contact:

D. Richard Kuhn

(301) 975-3290

email: kuhn@nist.gov

517NIST North

FUTURE STANDARDS FOR

SOFTWARE

NIST recognizes the need to increase and

adjust its involvement in technology specifi- cations used in the development of hightechnology software. In today's information

processing environment, it is becoming

increasingly common for many new technol- ogy specifications to be developed in organizations outside the formal standards environment and for those technology specifications to quickly become de facto standards. Accordingly, NIST researchers are seeking to be involved with organizations, both inside and outside the formal standards environment, that are developing pivotal, forward-looking technology specifications in multiple areas related to the production of high-technology software. This involvement

will emphasize the development of appropriate metrics, measurement technology, and

techniques for testing conformance to new

high-technology software specifications. More information is available on

www.itl.nist.gov/div897/ssg/ssg.htm.

Contact: Bruce K. Rosen

(301) 975-3345

email: bruce.rosen@nist.gov 562 NIST North

GEOGRAPHIC

INFORMATION SYSTEMS

Geographic information systems (GIS) tech- nology allows users to collect, manage, and

analyze large volumes of spatially referenced and associated data. New research directions are emerging from the interdisciplinary uses

of GIS technology through studies integrating computer graphics standards, database management standards, expert systems tech- nology, and Global Positioning System tech- nology to support GIS applications. This

group's research is focused on providing GIS

compatibility through standards and confor- mance testing for GIS standards, such as the

Spatial Data Transfer Standard (Federal Information Processing Standard 173) - Because the activities of many governmental and private organizations are land- or location-based or both, GIS technology will be important in integrating existing spatial data to administer, manage, and monitor

people, money, and activities in accomplishing the objectives of these organizations.

Contact: Bruce K. Rosen

(301) 975-3345

email: bruce.rosen@nist.gov 562 NIST North

COMPUTER SECURITY

Division Contact:

Stuart W. Katzke

(301) 975-2934

email: stuart.katzke@nist.gov

fax: (301) 926-2733 426 NIST North

www.itl.nist.gov/div893

SECURITY TECHNOLOGY

Research and development efforts focus on

several areas:

• common, interoperable cryptographic

security technology, such as algorithms,

functionality, and interfaces, and protocols;

• public key infrastructure for managing

public key certificates needed to facilitate data integrity, authentication, access control, non-repudiation, and data confidentiality

services in global applications; and

• application interfaces for cryptographic modules.

Development efforts include standards, guid- r ance on the use of cryptographic technology, and conformance tests so that strong crypto- graphic mechanisms will be available for the protection of sensitive information.

CONFORMANCE TESTING

NIST researchers are designing and developing test methods for conformance tests and

using these methods to produce test metrics and test suites for evaluating the quality and

correctness of information technology products. Several conformance test metrics and

test suites have been produced for evaluating

implementations of Virtual Reality Modeling

Language, language compilers, computer

graphics metafile, Java, database language

SQL, Programmers Imaging Kernel System

(PIKS), and POSIX. In collaboration with

industry, the user community, and various

testing laboratories, NIST researchers work

to identify new technologies and to develop measurement schemes, test collections, refer- ence implementations, test suites, and tools necessary to advance the technology and pro- duce usable, reliable implementations.

Past research has resulted in a method for minimizing subjectivity in the evaluation of visual results in graphics testing. This method is implemented by a customizable

interface, randomized self-explanatory displays, and automatic capture of results. Recent activities focus on new methods for software testing based on statistical measures

as well as automated test generation methods to develop conformance tests. More infor- mation is available on www.itl.nist.gov/

div897/ctg/ctg.htm.

Contact: Lynne S. Rosenthal

(301) 975-3353

email: lsr@nist.gov 562 NIST North
INFORMATION TECHNOLOGY LABORATORY 1

Cryptographic standards promote interoperability and an acceptable level of security. Testing of products that were built to con- form to the standards verifies that the provisions of the standards were implemented

correctly. NIST has begun testing of more

complex cryptographic modules through

accredited, private-sector laboratories and

plans to promote testing of entire systems in

the future. The cryptographic module validation program encompasses testing for crypto- graphic modules (Federal Information

Processing Standard, or FIPS, 140-1), the Data Encryption Standard and its modes of operation (FIPS 46-2 and 81), the Secure Hash Standard (FIPS 180-1), and the Digital

Signature Standard (FIPS 186). For details,

visit http://csrc.nist.gov/cryptval.

Contact:

Miles Smid

(301) 975-2938

email: miles.smid@nist.gov 426 NIST North

SYSTEMS AND NETWORK

SECURITY

Research, development, and application

efforts focus on secure, interoperable systems

to protect the integrity, confidentiality, reliability, and availability of information and

systems. R&D efforts address technical areas such as advanced countermeasures (for

, example, intrusion detection, firewalls, and

scanning tools); vulnerability analysis and

mitigation, access control, and incident

response; security criteria and metrics; assur- ance methods; role-based access control to network resources; and Internet security. More information is available on

1 http://csrc.nist.gov.

The National Information Assurance Partner1 ship, recently established by NIST and the National Security Agency, will form a part-

. nership with the government, industry, and

academic communities to accomplish several goals:

• assist those communities in meeting their

security assurance and testing requirements,

• conduct R&D in security assurance and

testing methods and approaches, and

• establish a commercially viable Common

Criteria-based testing program. More infor- mation is available on http://niap.nist.gov.

Contact: Tim Grance

(301) 975-4242

email: tim.grance@nist.gov 426 NIST North

ADVANCED NETWORK

TECHNOLOGIES

Division Contact:

Craig Hunt

(301) 975-3600

email: craig.hunt@nist.gov

fax: (301) 590-0932 445 NIST North

http ://snad.ncsl . nist . gov

HIGH-SPEED NETWORKS

NIST researchers are working with industry

in the development of protocols for the broad- band integrated services digital network

(B-ISDN) or asynchronous transfer mode

(ATM) networks, and hybrid fiber-coaxial (HFC) systems. The goal is to expedite the development and deployment of high-speed,

interoperable communications systems and

services. NIST provides leadership at the ATM

Forum in developing test suites for ATM product interoperability and standards confor- mance testing.

Research projects include ATM network simulation and modeling, evaluating the completeness and correctness of ATM routing

protocols, evaluating proposals for the Media

Access Protocol for HFC systems, and developing test and measurement methods for interoperability and conformance. More

information is available on http://

isdn.ncsl.nist.gov.

Contact: David Su

(301) 975-6194

email: david.su@nist.gov 445 NIST North

MULTIMEDIA AND DIGITAL

VIDEO

NIST researchers are working with industry

to promote the development of cost-effective,

interoperable, distributed multimedia appli- cations and to enable the development of

digital video technologies for broadcast,

interactive television, video-on-demand, and

video conferencing. Research emphasizes measurement techniques for characterization of distributed multimedia tech- nologies and digital video devices and

services; techniques for integrating multi- media services with network technologies;

and industry-driven standards for multi- media technologies and digital video devices and services.

NIST researchers undertake forward-looking

research projects for evaluating generationafter-next technologies needed for collaboration, including the development of tools for fine-grained distributed event logging and

monitoring over the Internet. The technologies developed will provide an infrastructure

so that collaborative tools being tested may

log information and expose the log selectively to distributed test drivers. This work
02 INFORMATION TECHNOLOGY LABORATORY

is conducted in collaboration with the Defense Advanced Research Projects Agency. More information is available on http ://sn ad . ncsl . n ist . gov/madvt g/ madvtg.html.

Contact:

Jean-Philippe Favreau (301)975-3634

email: jean-philippe.favreau@nist.gov 445 NIST North

NEXT-GENERATION

INTERNET

NIST researchers are working to remove barriers to the next generation of reliable and

secure internetworking technologies and inte- grated network services. The focus of research is on testing methods and reference implementations for next-generation

internetworking technologies; interoperability among next-generation internetworking

products; and measurement techniques and

performance characterizations for network

services that integrate voice, video, and data.

Research projects include investigating

changes to the Internet architecture that will support guaranteed bandwidth and quality of

services for real-time applications, such as audio, video, and synchronized data. This

project focuses on the scalability of the pro- posed enhancements, interoperability issues, and methods and metrics to characterize the

digital data streams. More information is available on http://snad.ncsl.nist.gov/itg/

itg.html.

Contact: Doug Montgomery

(301) 975-3630

email: dougm@nist.gov

445 NIST North

HUMAN-COMPUTER

INTERFACE TECHNOLOGIES

Division Contact: Martin Herman

(301) 975-2944

email: martin.herman@nist.gov

fax: (301) 975-5287 A216 Technology Building

www.itl.nist.gov/div894

SPOKEN LANGUAGE

TECHNOLOGY

Recent advances in automatic speech recognition (ASR) technology have enabled the development of automatic dictation and

spoken language understanding systems and

prototype spoken language interfaces to information technology. Interdisciplinary

efforts involve the natural language processing, information retrieval, and cognitive

engineering (for example, usability testing and human factors) communities.

Much of the relevant research is "corpus- based" and relies on shared use of spoken

language databases and standard test methods.

NIST works closely with researchers, other government agencies (such as the Defense Advanced Research Projects Agency), and the

Linguistics Data Consortium in the collection, processing, characterization, and distri- bution of spoken language corpora.

Approximately 150 CD-ROMs have been pro- duced by NIST for use within the ASR and

spoken language research community. NIST

also develops and implements periodic

benchmark tests to define the state of the art

for research ASR systems. The scope of these

tests includes several forms of large vocabulary continuous speech, including

speech read from prepared texts, conversational speech, goal-directed spontaneous

speech, and, most recently, radio broadcasts.

Research facilities include workstations, speech-signal-processing software tools and

peripherals, and CD-ROM production tools. Areas of interest include characterization of spoken language data, ASR, natural lan- guage understanding and information

access, and usability testing. More information is available on www.itl.nist.gov/div894/ 894.0 1/slp.htm.

Contact: David S. Pallett (301) 975-2935

email: david.pallett@nist.gov A2l6 Technology Building

TEXT SEARCH AND

RETRIEVAL

NIST is working to accelerate the transfer of

better text search and retrieval technology

into commercial systems. One approach is to conduct a conference attracting international participation from more than 50

research groups in text retrieval, both from

industry and academia. The Text Retrieval Conference (TREC) is now starting its sev- enth year. Participating groups work with

large, diverse test collections built at NIST, submit their results for a common evaluation, and meet for a 3-day workshop to compare techniques and results. The conference

is starting to serve as a major technologytransfer mechanism in the area of text

retrieval. (See http://trec.nist.gov.)

NIST also has developed a public domain

prototype retrieval system (the PRISE sys- tem) capable of handling over 3 gigabytes of

data. This system uses natural language

input and state-of-the-art statistical ranking

mechanisms. The prototype serves as a research vehicle within NIST and as a starter

kit for groups outside NIST interested in working with these new types of search
INFORMATION TECHNOLOGY LABORATORY 1

engines or with the Z39 50 (ANSI/NISO) protocol for search and retrieval, which is used

for communication between the PRISE client and server. The PRISE server is especially

designed to isolate the search engine from

the details of the Z39 50 protocol and to minimize the effort needed to interface the

server to natural language search engines

other than PRISE. More information is available on www-nlpir.nist.gov.

Contact: Donna K. Harman

(301) 975-3569

email: donna.harman@nist.gov

A216 Technology Building

VISUAL IMAGE

PROCESSING

The visual image processing group develops

test methodology and testbed systems and

publishes test data for evaluating imagebased systems used in optical-character rec- ognition (OCR), document conversion to

electronic form, fingerprint classification, and face recognition. These evaluation methods are designed to include a wide variety of

statistical and neural network algorithms and system architectures including optical computing systems. The methods being

developed are used for automated fingerprint

classification, automation of data entry from

images of handprinted forms, automation of conversion of machine-printed documents to

electronic form, and measurement of recognition systems on realistic applications. Data

sets, evaluation software, prototype OCR, and

fingerprint classification and verification sys- tems are distributed on CD-ROM. More infor- mation is available on www.nist.gov/itl/ div894/894.03.

Contact:

Charles L. Wilson

(301) 975-2080

email: charles.wilson@nist.gov A216 Technology Building

INFORMATION

VISUALIZATION

The visualization group conducts research to demonstrate the utility and feasibility of information visualization and computer

graphic techniques to access, manipulate,

and exchange complex information. Infor- mation visualization is a process of trans- forming data and information that are not

inherently spatial into a visual form allow- ing the user to observe and understand the information.

NIST is developing an interactive visual interface to a statistical text retrieval system. The

objective is to demonstrate the utility of vis- ual interfaces for supporting access to large

collections of complex documents. Evaluation methodologies and test corpora for measuring scalability and usability of visual

interfaces, which are being constructed to support this endeavor, will be made available

to the research community. In the manufacturing domain, NIST is collaborating with

industrial partners to investigate how the

application of three-dimensional visualization, specifically Virtual Reality Modeling

Language, can speed up the manufacturing

process. This effort includes the use of commercial off-the-shelf software to create visualizations of factory floor assembly lines and

support for parts design and assembly. NIST

researchers are analyzing usability and per- formance capabilities of a number of virtual environment and World Wide Web visualization tools for these and other related applications. More information is available on

www.nist.gov/itl/div894/wrg.

Contact: Sharon J. Laskowski

(301) 975-4535

email: sharon.laskowski@nist.gov A216 Technology Building

MATHEMATICAL AND

COMPUTATIONAL

SCIENCES

Division Contact: Ronald F. Boisvert

(301) 975-3812

email: ronald.boisvert@nist.gov

fax: (301) 990-4127

365 NIST North

http://math.nist.gov/mcsd

MATHEMATICAL MODELING

Mathematical and computational problems

are becoming more elaborate as measure- ment techniques, physical understanding,

and computational capability improve. Solv- ing these problems requires innovative combinations of the methods of modern applied and computational mathematics. With the collaboration of other scientists and engineers, NIST mathematicians develop and

analyze mathematical models of phenomena; design and analyze computational methods and experiments; transform these methods into efficient numerical algorithms

for modern, high-performance computers;

and validate and extend the models by comparing them with experiments. Major

research interest areas include crystal growth, fluid flow, electromagnetic waves, magnetic materials, molecular dynamics,

foams, and polymers. Frequently occurring

mathematical areas include partial differential equations, random processes, and

inverse problems. More information is available on http://math.nist.gov/mcsd.

Contact: James L. Blue

(301) 975-3809

email: james.blue@nist.gov 365 NIST North
104 INFORMATION TECHNOLOGY LABORATORY

MATHEMATICAL

SOFTWARE

The increasing prevalence of computation in science and engineering has generated an

acute need for accurate and robust computer

software to solve frequently occurring mathematical and statistical problems. NIST

mathematicians and computer scientists are

actively involved in the development of algo- rithms for the solution of such problems, as

well as in their reliable and maintainable implementation on modern highperformance computers. Division researchers undertake specific projects in response to both internal NIST needs and the needs of

the computational science community in

industry and academia. Recent efforts address such problems as the evaluation of mathematical functions, the adaptive solution of partial differential equations on distributed memory multiprocessors, the

solution of large sparse linear systems, and

object-oriented numerical software design.

Access to such software is provided by the Guide to Available Mathematical Software,

a virtual repository of mathematical and statistical software for use in computational sci- ence research. This work is part of NIST's

efforts to improve the environment for mathematical software research, develop- ment, and use. Of particular concern in

recent years has been the development of test- ing and evaluation methodology, including

reference data, algorithms, and related services, which serve to assess the performance of

algorithms and software products. Recent examples include the Matrix Market, a

repository of test data for large sparse linear algebra problems, and the Digital Library of Mathematical Functions, an online successor

to the popular National Bureau ofStand- ards Handbook ofMathematical Functions. More information is available on

http ://m ath . nist. gov/mcsd

Contact: Ronald F. Boisvert

(301) 975-3812

email: ronald.boisvert@nist.gov 365 NIST North

OPTIMIZATION AND

COMPUTATIONAL

GEOMETRY

The use of optimization techniques is increasing in design, process modeling, and

broad areas of science and engineering, eco- nomics, and management. Examples

include the use of optimization models in curve and surface fitting, parameter estimation, maximum entropy, minimum energy, and maximum likelihood as well as in newer

areas such as performance improvement in production systems and advanced design and

control. Improved algorithms and computational power have led to the consideration of multidisciplinary optimization models that pose significant new challenges in all areas

of optimization. Division researchers design,

analyze, and implement large-scale optimization algorithms and use these methods to develop and solve optimization models in many areas. Current concentration is on

large-scale algorithms for nonconvex, nonlinear programming problems using interior- point methods and sequential quadratic

programming.

Computational geometry is a rapidly emerging field with applications in robotics, statistical mechanics, manufacturing

engineering, cartography, computer graphics, materials science, and molecular dynamics. NIST researchers are developing robust and efficient computational schemes for

large-scale terrain modeling, manufactured

parts recognition, and related problems. Algo- rithms and software are in wide use at NIST

and many other scientific and commercial

centers. More information is available on

http://math.nist.gov/mcsd.

Contact: Ronald F. Boisvert

(301) 975-3812

email: ronald.boisvert@nist.gov 365 NIST North

IMAGE COMPRESSION

A recurring theme in information science is

the need for efficient encoding of stored and

transmitted information. Common information encoding schemes are typically ill-suited

to computers and to data networks and, as a

result, can be improved substantially. Image

compression is an important emerging concern because the infrastructure does not meet the user demands for still images, sequences of still images (for example, in

exploratory surgery), and video. More importantly, the trends indicate that the demand

for image compression will increase while

the systems of the future, by being highly

mobile, will rely on inherently limited communications and storage technologies (for example, wireless communications and

storage media of minimal weight).
INFORMATION TECHNOLOGY LABORATORY -j

NIST scientists perform applied and refer- ence implementation research in areas including the development of efficient image

compression techniques with emphasis on

wavelets, on adapting generic compression

techniques for image compression, and on

error correction codes that are tuned to the needs of image compression. The scientists

also develop reference software and data that

facilitate algorithm development and the testing of such algorithms for performance and

correctness of output (for example, compli-

^ ance testing). Finally, metrics for quantifying the quality of the images produced by

lossy compression schemes are being developed. More information is available on

http://math.nist.gov/mcsd.

Contact:

Tassos Nakassis

(301) 975-3632

email: anastase.nakassis@nist.gov

I 365 NIST North

STATISTICAL ENGINEERING

Division Contact:

Keith Eberhardt

(301) 975-2853

email: keith.eberhardt@nist.gov

I fax: (301) 990-4127

353 NIST North

www.itl.nist.gov/div898

COLLABORATIVE

RESEARCH AND

DEVELOPMENT

NIST statisticians collaborate with other

I researchers within ITL, other NIST labs, and

! industry. Most projects address measurement

I and standards aspects of physical science, engineering, and information technologies.

Statisticians help in understanding the problem, the relevant data, and their relationship

to the purpose of investigation. The collaboration continues with generation of data, use

of available data, model specification, data

analysis, uncertainty evaluations, and

graphical analyses. Information technologies provide new challenges and opportunities for creative application of statistical methods. Collaborations with industry are done through cooperative research and devel- opment agreements (CRADAs).

Recent and ongoing projects include the

following:

• improved standardization of hardness measurements to allow industry to write

tighter specifications for product hardness;

• developed a statistical measure of sharpness of scanning electron microscope

images—industry is using the technique;

• developed a web service (www.itl.nist.gov/

div898/strd/index.html) that provides refer- ence data sets with certified computational

results that enable objective evaluation of

statistical software;

• developing statistical methods for software conformance testing to indicate confidence

that a program is correct and executes

correctly;

• developing a statistical process control paradigm for security of computer networks

that flags intruders as process anomalies through a visualization interface;

• developing statistical methods for testing performance of information retrieval search

engines;

• developing methods to characterize meas- urement uncertainty and establish traceability to NIST of highly accurate measurements made by coordinate measuring machines; and

• developing a generic test method through

a CRADA for electromigration reliability test- ing of magneto-resistive heads used in computer disk drives, which is a multibillion

dollar industry.

More information is available on www.itl.

nist.gov/div898.

Contact: Raghu Kacker

(301) 975-2109

email: raghu.kacker@nist.gov

353 NIST North

MEASUREMENT PROCESS

EVALUATION

Measurement is the backbone for advancing

scientific research and creating new technologies. NIST statisticians collaborate with

subject experts in developing techniques for evaluating measurement processes, tying measurement processes to accepted standards, and ensuring the quality of measurements. Expertise in the design of experi- ments, modeling, estimation of components

of variance, interlaboratory studies, quality

control, and uncertainty analysis, coupled

with a strong focus in applied research, brings statisticians into contact with leading

researchers in measurement science, both at NIST and elsewhere. This expertise provides

opportunities for contributing to the meas- urement science base for emerging technologies such as the following:

• high-speed communications using optical

fibers,

• ultra-large-scale integrated circuits, and

• trapping of polarized ultracold neutrons.
INFORMATION TECHNOLOGY LABORATORY

There also are opportunities to work with NIST scientists and instrument manufacturers on improving the performance of precision instruments such as the following:

• vector network analyzers for the micro- wave industry,

• spectrophotometry measurement systems,

• probes for measuring sheet resistance of

silicon wafers, and

• ballistic imaging systems for evaluating

forensic evidence.

Statisticians also are active in the develop- ment and application of computational

methods and algorithms for feature extraction and pattern recognition in images created using several methods:

• atomic force microscopy,

• high flux X-ray tomography,

• neutron tomography,

• optical reflectance, and

• electron and optical microscopy.

More information is available on

www.itl.nist.gov/div898.

Contacts:

Keith Eberhardt

(301) 975-2853

email: keith.eberhardt@nist.gov

Carroll Croarkin

(301) 975-2849

email: carroll.croarkin@nist.gov

353 NIST North

HIGH-PERFORMANCE

SYSTEMS AND SERVICES

Division Contact: Dean Collins (301) 975-2869

email: dean.collins@nist.gov

fax: (301) 963-9137 A257 Technology Building

www.itl.nist.gov/div895

SCIENTIFIC VISUALIZATION

Researchers at NIST are developing and

applying advanced methods for using stateof-the art, computer-based scientific graphics for rendering complex experimental,

computational, and analytical results in physics and chemistry. Researchers use a

collection of vector and raster workstations,

photographic and video hardware, highspeed networking for transmitting large graphics data sets between computers and

graphics devices, and computational geometry algorithms and software for the analysis

of two- and three-dimensional data sets. Techniques also have been developed to manipulate dynamic objects in automated

design and manufacturing systems; to display quasicrystal structures with icosahedral symmetries and scanning electron tunneling

microscopy data with polarization analysis; and to study models of turbulent combustion

showing the dependence of solutions on time and fuel-oxidizer mixture parameters.

Contact: Gordon E. Lyon

(301) 975-5679

email: lyon@nist.gov A248 Technology Building

CONTINUAL UPGRADES

The laboratory maintains a central scientific computing environment for NIST staff in Gaithersburg and Boulder. It procures and

operates computer and communications

facilities and maintains them at state-of-theart levels suited to the needs of a highly

diverse scientific and engineering research and development community. The continuing program of upgrading responds to advances in hardware, software, and communications technologies as well as to changes

in the kinds of tools used in modern scientific research.

NIST specialists log and analyze the use of

the components of the facilities—hardware,

software, operating systems, and networks

to determine what changes or new equip- ment will be most useful. They take steps to acquire them where possible or to develop

them internally. They design interfaces as needed for users to gain access to the resources best suited to their needs. This work proceeds with a broad view of the overall operation of the computing environment and its interactions with external environ- ments as well as a detailed understanding of

the progress of hardware and software capabilities and of the roles of visualization and

networking in the design and execution of

scientific computing projects.

Contact: Jack Newmeyer

(301) 975-2966

email: jack.newmeyer@nist.gov

B08 Technology Building
INFORMATION TECHNOLOGY LABORATORY 1

PARALLEL COMPUTING

NIST researchers are active in a variety of

areas designed to provide easy access and use

of parallel or clustered computing. NIST scientists are facilitating the development of a standard for interoperability among different

' vendor implementations of the message pass- ing interface (MPI). They are producing a

test suite for testing an implementation's conformance to this interoperable MPI

standard.

NIST scientists develop software libraries and

algorithms for advanced development and

'

: for collaborations with the other NIST labs

over a diverse range of topics such as optical

absorption, fluid flow in porous media, dissipative particle dynamics, and dendritic growth in metallic alloys. These libraries simplify use of parallel computing through such

things as the automatic creation and use of MPI data structures with utilities such as AutoMap, AutoLink, and AutoLoad.

Researchers also create parallel tools such as

I Pade for transferring files, executing com- mands remotely, and receiving the output of

those commands on clusters of heterogene- ous computers. They create user interfaces

j such as WebSubmit, which is a Web-based

' graphical user interface used to submit

parallel computing jobs to supercomputers.

I More information is available on

j www.itl.nist.gov/div895/sasg.

Contact:

Judith E. Devaney

(301) 975-2882

email: judith.devaney@nist.gov A248 Technology Building

PERFORMANCE OF

MODERN-ARCHITECTURE

COMPUTERS

NIST researchers in the area of computer sys- tems performance are promoting the effective evaluation and efficient use of advanced

computers. Areas of interest include characterization of new computer architectures to

identify improved technology for applications, exploration of economical program- ming methods that standardize across

classes of architecture, and design of coherent evaluations that economically and reli- ably characterize the machines.

NIST researchers also are involved in the development of instrumentation and related management techniques for gigabit networks and for clusters of workstations and computers used for scientific calculations. A number

of instrumentation products are available;

these include VLSI MultiKron clock chips and plug-in boards, a comprehensive tuning

tool S-Check® for improving the perform- ance of concurrent codes, and hardware for

local synchronized clocks on cluster systems. More information is available on http://

cmr.ncsl.nist.gov.

Contact: Alan Mink

(301) 975-5681

email: amink@nist.gov A248 Technology Building

INFORMATION STORAGE

AND INTERCONNECT

SYSTEMS

The scope of the project is to develop test methods, technology, and standards for flat panel displays, digital data storage, multi- media, and photonic information processing systems that enable high performance computing and communications. Emphasis is on

systems integration and the metrological

techniques for integrated information

systems and subsystems. Research and devel- opment is categorized in three areas:

• advanced display technology systems

working with the U.S. display industry to test and develop digital display interfaces and

resolution-mapping algorithms;

• holographic storage and advanced optical

solutions—conducting research in the areas

of optical character recognition systems

(fingerprints and images) and developing

metrology techniques to characterize holo- graphic storage systems; and

• high-performance storage concepts and

standards—characterizing emerging highstorage optical media like optical tape and

digital video disks and working with the U.S. storage industry to develop universal test methods for media-error monitoring tools

for optical tape.

More information is available on http://

cmr.ncsl.nist.gov.

Contact:

Victor McCrary

(301) 975-4321

email: victor.mccrary@nist.gov A248 Technology Building
08 INFORMATION TECHNOLOGY LABORATORY

RESEARCH

FACILITIES

COMPUTER AND

NETWORK SECURITY

FACILITY

The NIST Computer and Network Security

Facility is used to improve the current security posture of federal computer and telecom- munication systems and to provide security

for these systems as they migrate toward open system environments. Research per- formed in the facility is aimed at applying

methods to protect the secrecy and integrity

of information in computer systems and data

networks, evaluating personal identification and authentication techniques to control

access to information resources, and developing computer and network security architectures to determine proper implementation of controls for integrity and confidentiality of information and authentication of users.

CAPABILITIES The facility is equipped with desktop computers and workstations, security devices, terminals, personal identification systems, and

access to supercomputers through localarea, national, and global networks. Several communications technologies and applications environments are available for research

efforts for developing and testing security protocol standards.

Operational capabilities include a computer

emergency response team to facilitate identification and response to acute computer and

telecommunications security incidents involving self-replicating computer viruses.

Test and evaluation capabilities range from

specific functionality tests of cryptographic modules to test methodologies for network

security protocols to the specific criteria used

to evaluate the trustworthiness of systems

that handle unclassified, but sensitive, data.

A laboratory is available for research in risk management techniques and methodologies and evaluation of risk management software

to determine applicability to environments at

different agencies. Several computers support

the development of advanced computer

access control systems based on smart-token

technology and the virus laboratory for research in multiuser environments. A small

systems security laboratory completes the Computer and Network Security Facility.

APPLICATIONS The facility is used primarily to develop and

test federal standards for computer and net- work security. Support is provided to other

federal agencies and industry where the protection of unclassified data is required.

AVAILABILITY

Collaborative research programs can be

arranged.

Contact:

Stuart W. Katzke

(301) 975-2934

email: stuart.katzke@nist.gov 426 NIST North

ADVANCED NETWORK

FACILITY

The facility is equipped with desktop computers, workstations, protocol analyzers, and

simulators as well as ATM, ISDN, Internet, and satellite communications facilities and

switches.

APPLICATIONS

Facilities are used to develop and assess design alternatives, evaluate performance, and test standards for advanced communications and distributed multimedia systems, which include the following:

• ATM Network—The testbed consists of an ATM switch and several workstations. The

testbed is connected to the NIST ATM net- work and a wide-area ATM testbed.

• Digital Video Interoperability Testbed

The testbed consists of facilities for testing the video-on-demand application conforming to the Digital Audio/Visual Council specification, including MPEG2 video source and

server, digital storage management com- mand and control system, and set-top units. Various network access mechanisms, in addition to ATM networks, are being planned.

AVAILABILITY

Collaborative research programs with govern- ment, industry, and academia can be

arranged.

Contact:

Craig Hunt

(301) 975-3600

email: craig.hunt@nist.gov 445 NIST North
MANUFACTURING

ENGINEERING LABORATORY

NIST engineers and scientists are developing many of the underpinning components of automated intelligent-processing systems that soon will be the core of all world-class manufacturing operations. These components include intelligent machines: advanced sensors for real-time

in-process measurements; software for precision control of machine tools; and infor- mation technology for integrating all elements of a producfs life cycle.

NIST's Manufacturing Engineering Laboratory (MEL) provides technical support

for industry groups that develop standards

for measurements, measurement techniques, hardware, software, and data

interfaces.

MEL realizes the fundamental units of length and mass and disseminates measurements in those areas as well as in

force, vibration, acoustics, and ultrasonics. MEL researchers are working to develop a sound basis for measurements

and standards that support advanced applications of information in manufacturing.

It operates the National Advanced Manufacturing Testbed, a unique national

resource for studying the advanced infrastructure technologies required to support

future manufacturing operations at both

the systems and equipment levels. Laboratory researchers also work at the forefront

of the emerging field of nanofabrication,

developing measurement tools for atomicscale production technologies of the

future.

Laboratory staff members work closely with their industry counterparts, from the planning of research projects to the dis- semination of results.

Contact: Richard H.F.Jackson, Director

(301) 975-3400

email: richard.jackson@nist.gov

fax: (301) 948-5668 B322 Metrology Building

www.mel.nist.gov

COOPERATIVE RESEARCH

OPPORTUNITIES

Precision Engineering

110 Complex Form Metrology Laboratory

110 Surface Finish and Microform Measurement

110 Atomic-Scale Measuring Machine

111 Measuring Patterned Layers on

Integrated Circuits

1 1 1 Computational Metrology of Manufactured Parts

111 Coordinate Measuring Machine

Calibration Methodologies

112 Hexapod Metrology

112 Large-Scale Artifact Calibration

112 Laser Tracker Metrology

Automated Production Technology

113 Closed-Loop Manufacturing Program

113 Precision Machining Research

1 1 3 Advanced Optical Systems

114 Sensor interfaces and Networking

114 Machine-Tool Performance Models and Machine Data Repository

1 1 4 Controlling Subsurface Damage in Single-Crystal Components

115 Force Research

1 1 5 Acoustic and Vibration Research

115 Mass Research

116 Ultrasonics for Industry

Intelligent Systems

116 Enhanced Machine Controller

116 Next Generation Inspection System

117 Intelligent Systems Architecture for Manufacturing

117 Outdoor Mobility

118 RoboCrane®

1 1 8 Advanced Welding Manufacturing System

118 Hexapod Project at the National Advanced Manufacturing Testbed

119 Operator Interface

1 1 9 Software Engineering for Real-Time

Controllers

Manufacturing Systems Integration

120 Systems Integration for Manufacturing

Applications Program

120 Tolerancing and Metrology Research

121 Engineering Design Research

121 Computer-Aided Manufacturing

Engineering

122 National Industrial Information

Infrastructure Protocols

1 22 Product Data Exchange Standards for Manufacturing

123 STEP Conformance and Interoperability Testing

123 Manufacturing Resource Data

Representation

124 Process Specification Language

RESEARCH FACILITIES

124 National Advanced Manufacturing

Testbed 125 Acoustic Anechoic Chamber Facility

125 Mass Standards Facility
-jig MANUFACTURING ENGINEERING LABORATORY

COOPERATIVE RESEARCH

OPPORTUNITIES

PRECISION

ENGINEERING

Division Contact: Dennis A. Swyt

(301) 975-3463

email: dennis.swyt@nist.gov

fax: (301) 869-0822 A109 Metrology Building

www.mel.nist.gov/div821/home.htm

COMPLEX FORM

METROLOGY

LABORATORY

The mission of the Complex Form Metrology

Laboratory is to develop and extend NIST's

world-class dimensional measurement

capabilities to include forms with complex

shapes (e.g., gears, threads, and turbine

blades), necessary to satisfy industry's advanced measurement needs. Building on

NIST's expertise in the measurement of American Petroleum Institute thread

gauges, MEL currently is re-establishing NIST as the pinnacle of dimensional traceability for complex form three-dimensional

artifacts for gear manufacturers. Traceability is essential if U.S. industry is to maintain

quality and interchangeability of its parts and assemblies, especially as dimensional

tolerances continue to decrease. In turn, reliable methods for ensuring dimensional precision and accuracy underlie the ability of

U.S. manufacturers to compete in world

markets. To this end, NIST has installed,

error mapped, and "super tweaked" a new

high-accuracy coordinate measuring

machine in a state-of-the-art temperature-

(± 0. 1 degree Celsius) and humidity-

(± 2 percent) controlled environment. Working with an industrial advisory group—the American Society of Mechanical Engineers'

Committee on Gear Metrology—NIST

already has begun to satisfy the traceability needs of the gear industry. A special meas- urement capability for gear involute, lead, and index artifacts now is available. The

laboratory, in its research and measurements, places particular emphasis on the establishment of uncertainty for the measurement of complex forms.

Contact: Howard Harary

(301) 975-3485

email: howard.harary@nist.gov Bl 13 Metrology Building

SURFACE FINISH AND

MICROFORM

MEASUREMENT

Surface microstructure affects the operation

of components in the automobile, aerospace, semiconductor, metals, and optics

industries. NIST is developing measurement

techniques and standards to benefit all of

these manufacturing industries.

NIST played a key role in coordinating the development of a new national standard for surface texture measurement as part of the American Society of Mechanical Engineers

Committee B46. For the metals industry, NIST has developed a new approach to measuring the geometry of Rockwell C hardness

indenters that has quickly become the most

accurate in the world. NIST plans to use the instrument to control indenter geometry,

thereby controlling the accuracy of the hardness measurement itself. This will unify Rockwell C hardness scales worldwide.

For the optics and semiconductor industries, NIST has developed a calibrated atomic

force microscope, which is calibrated against the wavelength of light in all three coordinate axes. A principal goal of this

project is to calibrate three-dimensional artifacts that will be used to calibrate scanning

probe microscopes. NIST also has used this instrument to measure prototype atombased step height standards that collaborators at the University of Maryland fabricated from silicon single crystals. The Precision Engineering Division also is responsible for

certifying Standard Reference Materials for roughness and for calibration of the magnification of scanning electron microscopes.

Contact: Theodore Vorburger

(301) 975-3493

email: theodore.vorburger@nist.gov

Al 17 Metrology Building

ATOMIC-SCALE

MEASURING MACHINE

To help meet the measurement needs of

industries preparing to manufacture future generations of nanoelectronic devices and

circuits, NIST has designed and built a sys- tem—called the Molecular Measuring

Machine (M-cubed) —to measure to nanometer accuracies the positions of features

located anywhere within a 50-millimeter by

50-millimeter area. Achieving this capability

for M-cubed required the development and

integration of many forefront technologies: atomic-resolution scanning probes, ultra- high-accuracy interferometry for displace- ment measurements, precision nanomotion

generation, and combined active and passive vibration-isolation systems.

In one demonstration of its capabilities, M-Cubed imaged with nanometer-scale

resolution an array of chromium lines over

a 5-micrometer by 1-millimeter area. Analysis of the image data yielded an average line spacing of 212.69 nanometers. The esti- mated standard uncertainty for the measure- ment was of 0.03 nanometer, which is about

one-tenth the distance of typical interatomic

spacings. In another measurement, the atomic-resolution scanning probe was able

to track continuously a grating surface for

10 millimeters, counting out 49,996 lines
MANUFACTURING ENGINEERING LABORATORY

and measuring an average line spacing of 200.011 nanometers. This grating now is being used as a reference standard for an

X-ray spectrometer being built by NASA for use in space. M-cubed also will serve as an

exploratory tool for building mechanical and electrical structures in the nanometer

size range. Among the organizations that have collaborated on the construction of M-cubed are several major universities and

national laboratories as well as IBM Watson

Research Center, AT&T Bell Laboratories (now Lucent Technologies), and Zygo Corp.

Contact: John Kramar

(301) 975-3447

email: john.kramar@nist.gov A117 Metrology Building

MEASURING PATTERNED

LAYERS ON INTEGRATED

CIRCUITS

NIST researchers are developing techniques

for measuring the critical dimensions of patterned layers on integrated circuits. Work

involves theoretical projects on the formation of images in optical, scanning electron, and scanning probe microscopes as well as experimental and design projects on the construction of new metrology instruments for

the calibration of standards. The project was

initiated about 25 years ago at the request of

the semiconductor industry.

Critical dimensions for current semiconductor production are at about 0.25 micrometer. These ever-decreasing dimensions

have created a continual demand for new

and improved measurement techniques

j and related standards. As feature sizes

| become smaller than the wavelength of light used in conventional optical metrology

instruments, measurements and standards become especially important. The dimensions of current NIST optical photomask

standards range from about 0.5-micrometer

to 30-micrometer linewidths and potentially

will extend to smaller dimensions in the

future. A series of three linewidth/pitch Standard Reference Materials (SRMs) for photomasks is now available. For the scan- ning electron microscope, a semiconductorbased research material (RM 8090)

currently is available for SEM magnification

calibration with a minimum pitch of 0.2 micrometer stepping to a maximum pitch

of about 3 millimeters. The artifacts for the

future Standard Reference Material currently are being fabricated. RM 8090 (and

the future SRM) is useful at both high and

low accelerating voltage modes of the instru- ment. Research is in process for the develop- ment of new and improved standards for use

in instruments utilizing optical, scanning

electron, and scanning probe microscopy for integrated circuit metrology.

Contact: Michael T. Postek

(301) 975-2299

email: michael.postek@nist.gov

Al 17 Metrology Building

COMPUTATIONAL

METROLOGY OF

MANUFACTURED PARTS

Coordinate metrology, such as embodied in coordinate measuring machines (CMMs),

involve complex mechanical structures and

mathematical compensation and manipulation of data. Although CMMs are widely used

in industry, their sources of measurement

error are poorly understood and factors

affecting the inspection strategy are far from

optimized. Consequently, significant eco- nomic benefit can be realized by understanding the fundamental metrology of CMM inspection.

This project focuses on first-principle calculations of CMM error sources and their propagation through the inspection system

into the final result, such as the measured

geometry. NIST is conducting research on:

• point-sampling strategies for real, three- dimensional manufactured parts produced

by various manufacturing processes;

• modeling and assessment of residual

errors in CMMs, probes, and manufactured

parts;

• modeling of the propagation of errors through the overall process to allow calculation of confidence-level estimates of the size of manufacturing deviations relative to toler- ances in the presence of measurement uncertainty; and

• the impact and assessment of measure- ment uncertainty in the formulation of part tolerance specifications.

Results from these research activities will allow computer simulation of the measure- ment process, such as a virtual CMM, permitting CMM metrologists to quantitatively

assess the impact of different inspection scenarios and provide traceability to CMM

measurements.

Contact:

Steve Phillips (301) 975-3565

email: steven.phillips@nist.gov B 1 13 Metrology Building

COORDINATE MEASURING

MACHINE CALIBRATION

METHODOLOGIES

Coordinate measuring machines (CMMs)

are becoming the tool of choice for the dimensional inspection of manufactured

parts in industrial and defense applications. Current procedures for CMM calibration are

typically based upon national standards that were designed to promote commerce, such

as the buying and selling of CMMs, and were

not designed to determine task-specific measurement accuracy.

This project concentrates on the develop- ment of artifacts and methodologies for cali- brating CMMs in a manner that can be used

in the calculation of measurement uncertainty. Additionally, the project involves the use of CMM interim testing to regularly ensure the dimensional capability of the inspection system. This work also will serve
2 MANUFACTURING ENGINEERING LABORATORY

as a prototype inter-service CMM calibration program for use throughout the U.S. Depart- ment of Defense and will provide a unified approach to CMM evaluation and traceability, which will reduce duplication of effort in complying with a multitude of standards.

Results of the project will be proposed to national and international standards committees, and calibrated artifacts will be available through NIST's Standard Reference

Material Program and other domestic

sources.

Contact:

Steve Phillips

(301) 975-3565

email: steven.phillips@nist.gov

B113 Metrology Building

HEXAPOD METROLOGY

Machining centers based upon the Stewart platform concept offer the combination of

structural rigidity, high-speed tool positioning, and full five-axis motion control. These

features have drawn the attention of the automotive and aerospace industries and

tool, die, and mold manufacturers. Since

the machine configuration is based on computationally intensive servo-control algorithms, rather than upon fixed-axis mechanics, the need to perform tool position metrology for this class of machine

tools is critical for both the characterization

of positioning accuracy and the evaluation

of the performance guarantees of these systems.

The project has three distinct objectives:

(1) develop metrology tools for characterizing the performance of these machines,

(2) implement on-machine metrology to enhance the positioning accuracy of the NIST hexapod, and (3) provide access to the hexapod metrology database via the National Advanced Manufacturing Testbed (NAMT) environment.

The approach to achieve the first objective is

the design, development, and calibration of

a full six-degree-of-freedom metrology

instrument to characterize the positioning accuracy of the tool tip. The second objective, which is long term, is to implement a

laser-based strut length metrology and control system to enhance the positioning accuracy of the NIST hexapod. This objective

also requires the development and use of large-scale metrology techniques based on

an absolute-distance-measuring laser tracker that is distinctly different from conventional machine tool metrology. The final

objective focuses upon the implementation

of sensors and data acquisition systems, which are accessible through the NAMT.

Contact:

Fred Rudder

(301) 975-6500

email: fred.rudder@nist.gov Bl 13 Metrology Building

LARGE-SCALE ARTIFACT

CALIBRATION

Large-part manufacturing is requiring ever- decreasing tolerances. Many large-scale

parts, even in high-technology applications, lack interchangeability due to dimensional

variation. For example, more than one ton

of shims can be needed to assemble a large commercial aircraft. This additional weight can cost approximately $1 million per year per plane in additional operating costs.

Still, large-scale coordinate metrology is a

relatively neglected field. It lacks specific American National Standards Institute or International Organization for Standardization standards and associated artifacts

to assess the metrology instrumentation.

Similarly, the domestic infrastructure for high-accuracy calibrations of large dimensional standards is nearly non-existent. Manufacturers often must rely on foreign

metrology equipment vendors for calibration services. To fill these gaps, the largescale coordinate metrology group has embarked on a program of standardization,

artifact development, and calibration for

large-scale coordinate metrology systems, such as coordinate measuring machines,

theodolites, and laser trackers. One element

of this program is the Large-Scale Metrology

Calibration and Research Laboratory, currently under development. It will provide a

facility to perform high-accuracy one- dimensional measurements and calibrations, up to 2 meters, with a target expanded

uncertainty (k=2) of 0.3 micrometer + 0.5 x L micrometer/meter where L is in meters.

Contact: Gregory Caskey

(301) 975-3789

email: gregory.caskey@nist.gov B113 Metrology Building

LASER TRACKER

METROLOGY

Developed at NIST, the laser tracker, a port- able three-dimensional, interferometric- based coordinate measuring instrument, is being eyed for a growing assortment of largescale measurement tasks. To maintain competitiveness in the emerging worldwide economy, many manufacturers and suppliers have begun implementing International Organization for Standardization (ISO) 9000 quality systems and seeking ISO Guide 25-based measurement accreditation—both of which require traceability and hence measurement uncertainty

estimates. Unfortunately, the laser tracker

suffers the same difficulty as all three- dimensional coordinate measuring instru- ments when it comes to uncertainty

estimation. The error mechanisms are very complex and often task specific.

The large-scale coordinate metrology group

intends to work with users and manufacturers, through the American Society of Mechnical Engineers/American National Standards

Institute Standards working group, to develop a series of test procedures and artifacts that will characterize adequately the measurement performance capability of

these instruments. The output will be a national standard whose contents will detail

these tests as well as provide guidance for combining the test results into a realistic
MANUFACTURING ENGINEERING LABORATORY i 13

uncertainty estimate. Because of the newness of this technology, this will be the first known effort to standardize the performance

assessment of the laser tracker. It is antici- pated that the American national standard would be submitted to the ISO for consideration as the international standard governing

this technology.

Contact:

Charles J. Fronczekjr.

(301) 975-4079

email: charles.fronczek@nist.gov B113 Metrology Building

AUTOMATED PRODUCTION

TECHNOLOGY

Division Contact:

E. Clayton Teague

(301) 975-6600

email: claylon.teague@nist.gov

fax: (301) 869-3536 B102 Sound Building

www.mel.nist.gov/div822/home.htm

CLOSED-LOOP

MANUFACTURING

PROGRAM

This program aims to achieve higher quality

in existing manufacturing processes. A threeI layer, closed-loop control architecture is

i being implemented. The three layers are

real-time, process-intermittent, and post- process control loops. The real-time and

process-intermittent control loops imple- ment algorithms to predict and/or measure

machine- and process-related systematic

errors and then compensate for them in real time or near real time. The post-process control loop is used to verify the models used for the other two control loops and to tune them

by detecting residual systematic errors measured on the finished parts, correlating these

errors to machine- and process-related

errors, and modifying control parameters of the other loops accordingly.

Feature-based error analysis techniques are being developed to identify the residual sys- tematic errors of the machining system. NIST researchers are working with industry and academia to use the dimensional measurement interface specification, an American National Standards Institute standard, in analyses of part features. They are developing tools for feature segmentation of part geometries to improve analyses of machining processes. They also are developing

a quality database using feature types and

errors measured on these features as key

fields.

Contact: M. Alkan Donmez

(301) 975-6618

email: alkan.donmez@nist.gov

B106 Sound Building

PRECISION MACHINING

RESEARCH

There is an ever-increasing demand for

tighter tolerance components made from

"advanced" materials. The higher strength

and wear resistance of these materials also make them more difficult to machine.

Simultaneously, there is the demand for

finer features in integrated circuits, driving

the need for improved optics in the litho- graphic systems that make them on substrates, which also need to improve

continuously. Within its Precision Machining Research Facility (PMRF), NIST undertakes an integrated program of research and

development in manufacturing and metrol- ogy methods to serve these needs.

It is well known that the cost of machining

is limiting the rate of application of advanced ceramics. Research into highspeed grinding of ceramics offers the prospect of reducing costs. Rapid wheel wear, however, degrades part accuracy, and both

surface finish and the scale of surface

defects introduced during grinding must be

controlled. Hard steels are commonly

ground to achieve high-accuracy components. Turning with cubic boron nitride

tools may have economic advantages, especially for small lot sizes, but tool wear can

cause problems with surface integrity. PMRF

researchers are developing a basic understanding of the mechanisms of material removal and applying advanced sensor methods to process control. (New techniques

also are being developed for measuring optical and electronic surfaces. For information,

see Advanced Optical Systems, below.)

Contact:

Chris Evans

(301) 975-3484

email: christopher.evans@nist.gov

B102 Sound Building

ADVANCED OPTICAL

SYSTEMS

Advanced optical systems increasingly are designed around high-accuracy, aspheric

optical elements. Measuring the figure error

of generalized aspheres to the required accuracy is a complex and unsolved problem. NIST has worked with commercially avail- able phase-measuring interferometers and

demonstrated that software compensation

for some systematic errors is possible. Other

issues arising in the use of these instru- ments to measure aspheres, when no null

lens is used, limit achievable accuracy. As a

result, NIST has initiated a project to develop a next generation instrument. This instrument is being built under NIST contract and is due to be installed in late 1998. The resulting measurement service will support the manufacture of lightweight,

high-performance optical systems for space- based applications and multilayer mirror

systems for extreme ultraviolet and X-ray

lithography.

Contact:

Chris Evans

(301) 975-3484

email: christopher.evans@nist.gov B102 Sound Building
-114 MANUFACTURING ENGINEERING LABORATORY

SENSOR INTERFACES AND

NETWORKING

Sensors and actuators are used in a wide

variety of applications—industrial auto- mation, manufacturing process control, automated controls of building systems, semiconductor manufacturing, vehicle control, and intelligent highways. Increasingly

sophisticated and capable, sensors are devices and miniature systems that measure

pressure, acceleration, flow, force, temperature, vibration, torque, position, chemical

composition, and other process or environ- mental variables. The multibillion dollar market for sensors is poised for rapid

growth. Smart sensors, which incorporate

digital communication and control networking technologies, offer opportunities for a

host of new, innovative uses.

However, the lack of a common interface for connecting sensors to microprocessors and,

thus, to control and field networks impedes new applications and the benefits they are expected to deliver. It is prohibitively costly

for sensor producers to develop custom interfaces to support the multitude of networks and protocols in the market. Thus, sensor manufacturers are seeking a standard inter- face for sensors. NIST is working with industry and the Institute of Electrical and

Electronics Engineers (IEEE), a voluntary

standards organization, to develop a set of common interfaces for smart sensors. The

objective is to solve the device interchangeability problem and to further progress toward universal plug-and-play compatibility between sensors and networks. The stand- ard interfaces and associated technologies,

known as the IEEE 1451, also will provide

the enabling technology for the integration and networking of sensors and actuators in distributed measurement and control

systems. In addition, it will minimize the

risk of technology investment and accelerate

the implementation of smart technology on

sensors.

Contact: Kang Lee

(301) 975-6604

email: kang.lee@nist.gov B106 Sound Building

MACHINE-TOOL

PERFORMANCE MODELS

AND MACHINE DATA

REPOSITORY

To reduce design and production cycles, manufacturers need tools to predict their manufacturing capabilities before they start manufacturing prototypes for new products.

Prototyping is usually an iterative process, taking considerable time and effort before actual production can begin. It is a very

costly effort, since, in general, the outcome

cannot be predicted with existing design and

analysis tools. Developing tools to simulate and carry out this iterative process in the virtual domain presents a unique opportunity

for industry to reduce time for new product

introduction.

This project aims to replace actual machining and inspection of parts during prototyp- ing with virtual machining and virtual inspection modules incorporated into a CAD/CAM system. The virtual machining

module will simulate the movement of the cutting tool when making a part. In this simulation, the effects of error motions, pre- dicted from machine-tool characterization

data, will be reflected in the tool path.

Virtual machining will result in an elec- tronic approximation of the part that can be

inspected by the virtual inspection module. The virtual inspection module will deter- mine the uncertainties associated with the

selected inspection plans and equipment. These uncertainties will be checked against

the specified design tolerances of the part. This virtual environment will make it possible to optimize the manufacturing process by trying different machines and making

changes to the process plans or part designs.

A major challenge in creating a virtual manufacturing environment is the repre- sentation of the performance and capabilities of various machine tools. Currently,

there are no provisions in machine tool or coordinate measuring machine standards to store the performance information in any

electronic media. The lack of standard repre- sentation prevents the creation of machine

data repositories that are needed to test dif- ferent simulation algorithms and to compare the performance of a given machine

against many other machines within a similar category. To overcome this problem, NIST is collaborating with industry and aca- demia to develop a data dictionary along

with a standard format for representing

meaningful machine tool performance data. A Web-based repository also is being devel- oped to accommodate this data format. In

the next step, this repository will be populated with machine tool data from the project collaborators. In addition, remote data

analysis and graphical representation tools are being developed within the repository.

Contact: M. Alkan Donmez

(301) 975-6618

email: alkan.donmez@nist.gov

B106 Sound Building

CONTROLLING

SUBSURFACE DAMAGE IN

SINGLE-CRYSTAL

COMPONENTS

Minimizing subsurface damage (SSD) is a key to reducing fabrication costs and improving in-service performance for many optical and electronic components made from

single-crystal materials. The lack of reliable means to measure SSD results in increased

fabrication time and costs, and it necessitates additional steps to ensure adequate

performance. The hazard of SSD is real.
MANUFACTURING ENGINEERING LABORATORY

Damage incurred early in manufacturing is covered in later stages. Although components appear fully functional, they often are badly impaired. This is equally true for

glass, metal, and ceramic parts.

This project is a partnership between the Ceramics Division of the NIST Materials Sci- ences and Engineering Laboratory and

MEL's Advanced Production Technology

Division. It supports the Sapphire Statistical Characterization and Risk Reduction (SCARR) Program, an effort sponsored by

the U.S. military. SCARR aims to develop ref- erence fabrication and diagnostic practices

for sapphire and to build a supporting properties database for the material.

NIST's approach is, first, to define the physical nature and extent of the damage, using

the best available method. Next, using NIST

laboratory facilities, researchers apply one of

several non-destructive evaluation methods

to parts representative of ongoing fabrication steps. Optical microscopy—in one of its many forms—and X-ray topography are the methods of choice. Performing evaluations

at the fabrication site, during processing, is the primary goal of this project.

Contacts: Robert S. Polvani

(301) 975-3487

email: robert.polvani@nist.gov A117 Metrology Building

David Black

(301) 975-5976

email: david.black@nist.gov A163 Materials Building

FORCE RESEARCH

NIST research on force supports a variety of industrial sectors, including the aerospace, automotive, weighing, and construction

industries as well as manufacturers of materials and testing equipment. Results further progress in private-sector research and

development efforts, and they contribute to development of standards and improved cali- bration services.

Force measurement capabilities include a unique, fully automated facility featuring

the application of deadweight standards from 0.5 kilonewton to 4448 meganewtons.

Over the entire range, the standard uncertainty in the applied force is 0.0005 percent. Known worldwide, the facility is normally

maintained at 23 degrees Celsius. However, most of the deadweight machines are equipped with environmental chambers that cover a temperature range from -10 degrees

Celsius to 40 degrees Celsius.

Contact: Simone L. Yaniv

(301) 975-4917

email: simone.yaniv@nist.gov B102 Sound Building

ACOUSTIC AND VIBRATION

RESEARCH

Research on acoustic- and vibration-related

issues supports a variety of industries, often leading to standards and to testing and measurement methods that improve industrial and scientific capabilities. Acoustic and

vibration measurements underpin a broad spectrum of activities, including noise control and abatement, health and safety pro- grams, product development, acceptance

testing, condition monitoring, and object

detection.

Some of the economic impacts are very

large. Acoustic measurements of new jet engine noise levels can have multibillion

dollar impacts. Vibration and acoustic measurements in product development in the

auto industry are extensive. National goals

in health and safety also are very strongly

affected.

NIST researchers use advanced signalprocessing techniques to measure and

characterize frequency-dependent sensitivities of transducers and instrumentation used

in the generation or measurement of sound,

vibration, and mechanical shock. Measure- ment capabilities include a 450 cubic meter

anechoic chamber, which has been used for special measurements on, for example, towed arrays, micromachined microphones, and loud speakers.

Contact: Donald Eitzen (301) 975-6625

email: donald.eitzen@nist.gov A147 Sound Building

MASS RESEARCH

Research in the area of mass supports the

realization and dissemination of the funda- mental unit of mass, its traceability to the international standard, and the measure- ment of solid density. This research impacts

a broad spectrum of industries including the pharmaceutical, instrumentation, and

nuclear industries. Further, mass, a funda- mental unit, is key to the definition of derived units in both mechanical and electri- cal metrology; thus, the research potentially

affects all manufacturing and all technical communities. Measurement capabilities cover the range from 1 milligram to 27 000

kilograms. The most accurate measure- ments are performed in a dedicated clean room facility with tight environmental

controls.

Contact: Zeinajabbour

(301) 975-4468

email: zeina.jabbour@nist.gov A147 Sound Building
1 16 MANUFACTURING ENGINEERING LABORATORY

ULTRASONICS FOR

INDUSTRY

The ultrasonics group performs research, develops standards, and offers calibration

services in support of a number of industrial

sectors. Research includes the prediction,

generation, measurement, and analysis of high-frequency mechanical or "ultrasonic" waves. Ultrasonic transducers are developed and evaluated as prospective standards and

for applications to the testing of materials and manufactured parts. Calibration sys- tems are maintained for the manufacturing and medical communities.

Both pulse-echo and acoustic-emission tech- niques are studied and used. The range of ultrasonic frequencies extends from tens of kilohertz to tens of megahertz, with applications in gases, liquids, and solids. Manufacturing applications of the technology

include acoustic emission and referenceartifact calibrations, non-destructive

material-property and defect evaluation, dimensional and su;face topography measurements, and sensor-based process control. A principal medical application is for the

calibration of a transducer's radiated power

in diagnostic usage.

Contact: Gerald Blessing (301) 975-6627

email: gerald.blessing@nist.gov A147 Sound Building

INTELLIGENT SYSTEMS

Division Contact: James S. Albus

(301) 975-3418

email: james.albus@nist.gov

fax: (301) 990-9688 B124 Metrology Building

http://isd.cme.nist.gov

ENHANCED MACHINE

CONTROLLER

Controllers for manufacturing equipment, such as machine tools and robots, traditionally have been proprietary systems. The

closed nature of these controllers limits the

ability to fully integrate them into the manufacturing enterprise. Modifying closed controllers with new technology often is prohibitively expensive, and life-cycle costs are kept high as options for securing replace- ment parts or upgrades often are limited to single sources. Recently, the open systems model of desktop computing has been

adopted by commercial controller vendors. Emerging open architecture controllers lev- erage the computing and communications

markets, resulting in a dramatic improve- ment in performance and integration. Many

of these controllers also provide interfaces

for accessing and modifying internal parameters, enabling third parties to incor- porate technology enhancements quickly and cheaply. The goal now is to ensure some compatibility among them.

The enhanced machine controller (EMC)

program is a NIST effort to develop and vali- date a specification for interfaces to open

architecture controllers. This specification is being developed jointly with the Open Modular Architecture Controller (OMAC) Users Group, an organization of end users, vendors, and technology providers. Originating with a concept encouraged by General Motors Corp., Ford Motor Co., and Chrysler

Corp., the OMAC Users Group now includes 58 members. Through the OMAC Application

Programming Interface Working Group, NIST is working to develop and validate this specification in production applications.

NIST software for machine tool and robot

control resulting from the validation process

is freely available. Tests at small- and

medium-sized manufacturers are being conducted through the NIST Manufacturing

Extension Partnership. The intent is to transfer NIST open architecture controls technol- ogy to the small business community, so

that technology advancements can be made

available easily.

Contact:

Frederick M. Proctor (301) 975-3425

email: frederick.proctor@nist.gov B124 Metrology Building

NEXT GENERATION

INSPECTION SYSTEM

In-process and post-process inspection of

parts often slows the manufacturing process. The inspection of parts with complex geometry, where closely spaced measurements are needed, is especially time consuming.

Although the speed and density of data

collection can be increased greatly with advanced sensors, these sensors often cannot

be integrated into existing controllers due to closed or proprietary controller

architectures.

The next generation inspection system

(NGIS) project maintains a coordinate measuring machine-based testbed for developing and experimenting with open architecture

controllers, interface standards, and multiple advanced sensors. NIST's focus is to achieve fast, accurate, and flexible coordi- nate measurement of both simple- and

complex-geometry manufactured parts. NIST's current approach uses vision and

CAD model part data to guide inspection

using analog sensors. NIST is collaborating with the National Center for Manufacturing

Sciences NGIS consortium, whose members

are technology users and vendors.
MANUFACTURING ENGINEERING LABORATORY

The next generation of inspection systems

will inspect parts faster and allow better inte- gration of computer-based inspection sys- tems into the factory. User benefits will be higher quality, lower cost products; greater

productivity; and reduced time-to-market. Open architecture standards will lead to

better systems that are easier to upgrade,

stimulation of component markets, and

lower component prices through increased

competition.

Contact: William Rippey

(301) 975-3417

email: william.rippey@nist.gov B124 Metrology Building

INTELLIGENT SYSTEMS

ARCHITECTURE FOR

MANUFACTURING

Intelligent systems architecture for manufacturing (ISAM) is a reference model architecture for intelligent manufacturing systems.

It is intended to provide a theoretical frame- work for the development of standards and

performance measures for intelligent manufacturing systems. It also is intended to provide engineering guidelines for a wide

variety of manufacturing applications. The

ISAM model addresses the manufacturing

enterprise at a number of levels of

abstraction:

• At the highest level of abstraction, ISAM

provides a conceptual framework for viewing the entire manufacturing enterprise as an intelligent system consisting of machines, processes, tools, facilities, computers, software, and people operating over time on materials to produce products.

• At a lower level of abstraction, ISAM provides a reference model architecture for supporting the development of standards and

performance measures, as well as for designing manufacturing systems and software.

• At a still lower level of abstraction, ISAM

is intended to provide engineering guidelines for implementing specific instances of manufacturing systems such as machining

and inspection systems.

ISAM consists of a hierarchically layered set

of intelligent processing nodes organized as a nested series of control loops. In each

node, tasks are decomposed, plans are generated, world models are maintained, feedback from sensors is processed, and control loops

are closed. In each layer, nodes have a characteristic span of control, with a characteristic planning horizon and corresponding

level of detail in space and time.

Contact: Harry A. Scott (301) 975-3437

email: harry.scott@nist.gov B127 Metrology Building

OUTDOOR MOBILITY

Intelligent vehicle systems require open sys- tem architecture standards. Intelligent vehicles contain a multiplicity of subsystems

that recognize objects such as obstacles and

landmarks, map the environment for navigation, detect and react to unexpected objects,

locate objects for manipulation and handling tasks, compare object scenes for security and surveillance, plan paths, and

operate safely and robustly in unstructured environments. Open-systems architecture standards are needed to promote efficient

integration of these subsystems and simplify

development.

The goal of this project is to provide a test- bed for evaluating and validating opensystems architecture standards for

intelligent vehicle systems. Development

will be a jointly sponsored effort that leverages technology from the NIST intelligent machines initiative program and support from complementary programs sponsored by

other agencies. These include the Army

Research Lab (ARL) Demo III Unmanned

Ground Vehicles program and the AUTONAV

research project involving the German

Ministry of Defense, the U.S. Department of Defense, and the AUTONAV/U.S. Department

of Transportation Crash Avoidance program. The system will use advanced technology

available from the AUTONAV research team comprising NIST, ARL, David Sarnoff Research Center, Universitat der Bundeswehr in Munich (UBM), and Dornier

(Daimler-Benz).

The testbed consists of a high-mobility

multipurpose wheeled vehicle—a four- wheel-drive Army vehicle equipped with control actuators (on the steering, brake, and

throttle, for example); advanced sensors; and an open-architecture, real-time control system. This vehicle is capable of both high- way driving and off-road driving over rough

terrain. Advanced sensors on the vehicle include cameras, a laser range-imaging

camera, an inertial navigation system, and

a Global Positioning System satellite-based navigation system. The vehicle can be oper- ated remotely by a human operator via

teleoperation or autonomously via machine

vision systems. The control system is the NIST real-time control system, an opensystem reference architecture. Emerging

markets for intelligent vehicle systems

include autonomous material handling,

operations in hazardous environments, security surveillance, advanced motor vehicle

control, and aids for people with disabilities.

Contact: Maris Juberts (301) 975-3424

email: maris.juberts@nist.gov B124 Metrology Building
8 MANUFACTURING ENGINEERING LABORATORY

ROBOCRANE®

The NIST RoboCrane is a versatile robot crane that can precisely position and orient

its work platform in all six degrees of free- dom, so that large loads and equipment can

be held rigidly in place—even at an angle.

RoboCrane is the core of the intelligent sys- tems integration testbed for large-scale manufacturing and construction.

The prime motivation for the testbed is to

foster a coordinated and efficient technical response to industry's recognized need for open-architecture standards. These standards will facilitate development and use of

sensor-interactive, intelligent-machine sys- tems in large-scale tasks, such as construction, road building, bridge repair, and

aircraft assembly. Because interface standards now are lacking, subsystems are difficult to integrate and new capabilities are not added easily. As a result, system functionality is limited, development is prolonged, and

maintenance costs are high. By enabling

plug-and-play compatibility, standard interfaces would foster development of more efficient systems, and they would create new

market opportunities for software and hard- ware manufacturers. Greater compatibility

also would simplify and reduce the cost of customization and system upgrading.

With the aim of testing and validating open

systems architectures and their underlying

components, researchers at the testbed are exploring precision applications, such as machining and finishing operations, and

they are evaluating combinations of sensors and control strategies that result in safe and

reliable operation in unstructured, perturbation-prone environments.

Through collaborations with manufacturers, universities, and other organizations,

prototype standards and technologies will be

integrated and transferred into practical

applications such as manufacture of aircraft, ships, construction equipment, and

railroad rolling stock; construction and

maintenance of buildings, highways, and

bridges; environmental clean-up of radioactive or toxic waste sites; and undersea mining, construction, repair, and salvage

operations. These partnerships provide NIST

with an opportunity to refine advanced intelligent control concepts. They also further NIST's efforts to develop standards and meas- urement techniques for intelligent machine

systems.

Contact: Roger Bostelman

(301) 975-3426

email: roger.bostelman@nist.gov B124 Metrology Building

ADVANCED WELDING

MANUFACTURING

SYSTEM

Manufacturers and researchers have shown

that there are tremendous productivity, quality, and economic gains from using computerized systems to perform planning,

programming, and control for automated

welding. The challenges to manufacturers come in integrating the many specialized software and hardware components.

Research at the Advanced Welding Manufacturing System (AWMS) testbed is focusing on autonomous gas metal arc welding tech- nology. It has three goals:

• develop and validate standards that will contribute to increased use of automated

welding technology—potential customers

identified so far include shipbuilding, heavy

equipment manufacturing, and automotive manufacturing;

• demonstrate the ability of interface standards and intelligent control technology to increase productivity, improve quality, and

reduce the cost of system integration; and

• develop improved technology for auto- mated welding.

AWMS activities will be performed with

industry partners and based on industrystated needs. Faster progress in welding auto- mation systems technology can expand the range of applications where machines can

perform reliable welds in a cost-effective manner. Standards for interoperability of specialized advanced control, sensor, hardware, and software components will contrib- ute to better, less expensive welding systems; increased market share for compliant component vendors; and stimulation of new

product development. Further, AWMS

research with industry will develop new

intelligent control systems and anticipate standards needs for the future.

Contact: William Rippey

(301) 975-3417

email: william.rippey@nist.gov B124 Metrology Building

HEXAPOD PROJECT AT

THE NATIONAL ADVANCED

MANUFACTURING

TESTBED

Rapid production of quality contoured parts

requires machine tools that combine speed, accuracy, stiffness and multi-axis versatility.

In addition, manufacturers look for qualities such as ease of installation and movability to enable plants to be reconfigured to meet changing market demands. A new

class of parallel-actuated machine tools based on the Stewart platform mechanism

presents new possibilities for meeting these

needs.

However, much remains to be learned about the characteristics of these hexapod

machine tools before they will see widespread production application. Industry

workshops have highlighted several needs:

• standard test methods and measurement

procedures to evaluate their performance,
MANUFACTURING ENGINEERING LABORATORY

• a reservoir of application experience to draw from,

• modeling and simulation tools to help

speed the development of machining applications and test methods,

• remote access capabilities to make it

easier for collaborators to interact and

participate in hexapod research, and

• investigation of controller and integration issues.

This project is addressing these needs by

working with industry, university, and gov- ernment partners to develop capabilities in

the areas of characterization, remote access, and simulation of hexapod machines. The

work is being carried out within the National Advanced Manufacturing Testbed (NAMT) on an experimental prototype octa- hedral hexapod machine. A NIST Enhanced

Machine Controller (EMC) is being devel- oped for the octahedral hexapod to allow

integration with factory-level control soft- ware and to enable investigation of experi- mental control algorithms. To the extent

possible, models, measurement techniques, and other project results are being developed

in a generic form to allow them to be easily applied to other Stewart platform machines. NIST researchers are participating in a

national Hexapod Users Group to coordinate

research activities and share results.

Contact:

Albert J. Wavering

(301) 975-3461

email: albert.wavering@nist.gov B124 Metrology Building

OPERATOR INTERFACE

The operator interface program is researching needs for interface standards

for remote and distributed manufacturing,

particularly in the area of remote collaborative work involving operation of machines

and programs. One of the approaches NIST

is exploring for remote interaction is to construct remote "virtual environments," which

are based on real-time text and near-real- time graphics. Remote users will interact

richly with other remote participants and

local NIST researchers in real time, over the

Internet, at low cost.

Within the virtual environment, each

remote participant is represented by a

virtual entity called an "avatar." The avatar can interact both with other persons' avatars and with the environment in which all the avatars exist. The user sees on his or her

screen what the environment represents to

his or her avatar, and the environment

reacts to the actions of the user's avatar. Hence, other participants also see the acts of the user's avatar reflected on their screens. The environment itself manages consistency

so that when one person's avatar makes some change to the environment—such as moving something around or going to another part of the environment—all other

avatars experience the result in an appropriate manner, transparent to the users. A

unique feature of the NIST environment is

that real-world device controllers may be

represented by avatars in the environment.

This allows bidirectional interaction between remote users and remote devices through their avatars.

Contact:

Ernest Kent

(301) 975-3460

email: ernest.kent@nist.gov B124 Metrology Building

SOFTWARE ENGINEERING

FOR REAL-TIME

CONTROLLERS

Methodologies for designing and building

intelligent real-time control systems will improve productivity and capabilities in factories, power plants, transportation systems, and other complex applications. The current

state of the practice lacks the necessary tech- niques and tools for methodically designing,

analyzing, and validating control for these extremely complicated systems. Hence,

highly specialized engineers are required for the design and implementation of such sys- tems. The goal of this project is to provide

methodologies and tools to aid in the soft- ware engineering aspects of building real- time controllers.

In order to ensure compatibility with exist- ing practice and enhance usability by U.S.

industry, NIST will generate a mapping

between its own open system architecture and commonly accepted software engineering terminology. NIST researchers have begun comparisons between the real-time systems reference architecture and other paradigms, such as object-oriented architectures. They also are investigating formal methods and architectural description lan- guages to determine whether they provide

benefits in communicating architectural

principles and in facilitating system design,

construction, and validation.

Another project thrust is the experimental

development of a component-based

approach to building intelligent control sys- tems, with the eventual goal of supporting automated or semi-automated composition

tools. Working with commercially available computer-aided control system design tools, NIST researchers are creating controller "building blocks" and using them to construct a test system. The building blocks are elements of the controller open architecture, which can be assembled with the aid of a

tool. Researchers also have generated

in-depth specifications for a particular class

of components. These specifications can be

used for selecting, simulating, and validat- ing components when designing and build- ing a controller.

Contact: Elena Messina

(301) 975-3510

email: elena.messina@nist.gov B124 Metrology Building
20 MANUFACTURING ENGINEERING LABORATORY

MANUFACTURING

SYSTEMS INTEGRATION

Division Contact:

Steven R. Ray

(301) 975-3524

email: steven.ray@nist.gov

fax: (301) 258-9749 A127 Metrology Building

www.mel.nist.gov/msid

The standards development element focuses on applying NIST expertise to assist industry

in implementing voluntary consensus standards relevant to computer-integrated manufacturing. Successful implementation of manufacturing standards requires validation, pilots, and formal testing to ensure the standards meet the intended requirements. To this end, SIMA projects work on deploy- ment of standards testing methods utilizing HPCC technologies and participate in pilot implementations of HPCC technologies by

industry.

The testbeds and technology-transfer ele- ment focuses on establishment of testbeds

that both serve the infrastructure needs of SIMA projects and can be used as demonstration sites for collaborative tests between SIMA projects and industrial partners. One

such facility, the Advanced Manufacturing

Systems and Networking Testbed, has been

established, and another is under construction. Technology-transfer efforts also include development of infrastructure tech- nologies specialized to disseminate manufacturing information using HPCC techniques.

Numerous successful collaborative relationships with industry are under way. Among

these is the effort to design and develop a comprehensive electronic handbook for characterization of engineering problems

and relevant software applications with SEMATECH (Austin, Texas). Making these NIST statistical solutions available remotely

facilitates accurate analysis and solution of engineering problems in the most expeditious manner, such as at the user's workstation. Another SIMA project has facilitated

the establishment of the PlantSTEP consor- tium (Kansas City, Kan.), which is working

to speed the development of data exchange

protocols needed for the design of process

plants. Working with NIST, the consortium

ensures that the developing standard satisfies the intended data exchange require- ments for process-plant design. In another SIMA project, the development of testing methodologies for pilot implementations of

a data-exchange protocol for new product

design in the automotive industry is helping

to verify the usability of that standard for exchanges between U.S. car companies and

their suppliers.

Contact: Jim Fowler

(301) 975-3180

email: james.fowler@nist.gov A127 Metrology Building

TOLERANCING AND

METROLOGY RESEARCH

Concentrating on coordinate measuring sys- tems (CMSs), NIST researchers are developing the technical underpinnings of a unified framework for tolerance standards essential

to a range of design and manufacturing

activities. Ongoing projects are applying fun- damental metrology principles, numerical

analysis theory, and statistical methods to develop concepts and approaches for evaluat- ing the performance of CMS data-analysis

software. Other work is applying coordinate metrology to complex surface fitting, uncertainty estimation, and statistical tolerancing. Dimensional measurement methods for CMSs are another focus, which ultimately should lead to more effective sampling

strategies and data-analysis algorithms. Research is coordinated with ongoing standardization efforts in the United States and

internationally. Participation in standards committees guides selection of specific research topics and ensures that the results

are disseminated to industry.

Contact:

Neil Christopher

(301) 975-3888

email: neil.christopher@nist.gov A127 Metrology Building

SYSTEMS INTEGRATION

FOR MANUFACTURING

APPLICATIONS PROGRAM

Under the federal government's High Per- formance Computing and Communications

(HPCC) effort, NIST engaged in a major

initiative to enhance integration of advanced manufacturing applications

through utilization of information infrastructure technologies. This multiyear

initiative, called Systems Integration for Manufacturing Applications (SIMA),

involves all seven NIST Measurement and

Standards Laboratories with strong participation by U.S. industry, universities, and federal agencies. Launched in 1994, SIMA has

three major elements: manufacturing sys- tems, standards development, and testbeds/ technology transfer.

The manufacturing systems element focuses on development of interface specifications

for advanced manufacturing systems. Manufacturing applications being targeted by SIMA projects include design, planning,

scheduling, process modeling, shop control, simulation, inspection, assembly, and

machining. The integration and interface technologies being applied include networking, database technologies, frameworks, and

protocols for data exchange. SIMA projects span the industrial manufacturing domains

of mechanical products, electronics, and

construction.
MANUFACTURING ENGINEERING LABORATORY

ENGINEERING DESIGN

RESEARCH

Design plays a significant role in the iterative and collaborative engineering process. Decisions made during the engineering

design stage have a considerable impact on

the product's life-cycle costs. Hence, the global competitiveness of U.S. companies and industries depends significantly on the

capabilities and intellectual resources embodied and leveraged in design technologies. Through research and technology7

development, the engineering design group

supports and advances the evolution of

future design-related standards that respond

to industry's identified needs. Technical staff

participate in various standards efforts. Technology transfer is facilitated through an engineering design testbed.

The primary7 goal is to help U.S. industry

realize the full potential of current and

future engineering-design tools and techniques. NIST researchers are investigating

the issues involved in integrating a variety

of commercial and university "design"

tools. Topics addressed by current projects include virtual reality interfaces, product and process modeling, constraint representation, optimization, and engineering

ontologies.

A key issue in achieving an integrated product development environment involves the development of appropriate communication

and representation mechanisms. Standards

are critical to these communication and representation mechanisms. Active participants

in the International Organization for Standardization's STEP (Standard for the Exchange of Product Model Data) initiative, NIST staff are addressing how to incorporate

features, constraints, rationale, and other design information within the STEP

framework.

To promote technology transfer, a testbed

for engineering design has been established. This testbed provides a platform for testing and validating design methodologies,

developing standards for product and process models, storing and accessing design

case studies, aiding in supplier-chain integration, and helping in various aspects of technology transfer. NIST researchers are working with several universities and industries, particularly through the Defense Advanced Research Projects Agency.

Contact: Ram D. Sriram

(301) 975-3507

email: ram.sriram@nist.gov A127 Metrology Building

COMPUTER-AIDED

MANUFACTURING

ENGINEERING

Just as computer-aided design and engineering tools have revolutionized product design

during the past decade, computer-based

tools for production system engineering can

revolutionize manufacturing. A new type of computer-aided engineering environment is

envisioned, one that will improve the productivity of manufacturing and other industrial engineers. This environment would be used by engineers to plan the manufacture

of new products and to design and imple- ment future manufacturing systems and subsystems.

The overall goal of computer-aided manufacturing engineering (CAME) is to lower manufacturing costs, reduce delivery times, and improve product quality through the coordinated development and use of advanced tools. This project is aimed at advancing the development of software envi- ronments and tools for the design and engineering of manufacturing systems. NIST has formed the CAME Consortium with industrial partners to address these issues. With

industrial consortium partners, universities, and Defense Department manufacturing

facilities, NIST researchers are creating an

integrated framework, operating environ- ment, common databases, and interface standards for diverse manufacturing engineering software applications. This environ- ment will support and integrate a variety of emerging tools and techniques for designing, modeling, simulating, and evaluating

the performance of manufacturing processes, equipment, and enterprises.

The goal of one project is to build an inte- grated Manufacturing Engineering Tool Kit

for developing and validating manufacturing data for machined parts production. The

tool kit contains computer-aided design, process planning, simulation and product

data management systems. A methodology

has been specified for validating manufacturing data in a machine-shop environ- ment. Other researchers are creating a Production System Engineering Tool Kit for designing and modeling production lines for

the mechanical assemblies. Interface specifi- cations are being developed to allow commercial off-the-shelf software to

interoperate. Examples of the types of soft- ware products contained within the tool kits include computer-aided design, process planning, numerical control program verification, product data management, manufacturing simulation, and plant layout. Prototype tool kits and their interfaces have been demonstrated to the public on several

occasions.

Contact:

Charles McLean

(301) 975-3511

email: charles.mclean@nist.gov A127 Metrology Building
MANUFACTURING ENGINEERING LABORATORY

NATIONAL INDUSTRIAL

INFORMATION

INFRASTRUCTURE

PROTOCOLS

This activity is developing technology to enable industrial virtual enterprises and to

accelerate adoption of STEP (Standard for

the Exchange of Product Model Data) in the operation of these enterprises. Work is being

accomplished under a cooperative research and development agreement with the National Industrial Information Infrastructure Protocols (NIIIP) Consortium, comprising various manufacturers, technology

providers, universities, and federal agencies.

The overall NIIIP program is funded

through a Technology Reinvestment Project award. As a virtual enterprise, the NIIIP Consortium is a temporary confederation of

firms that come together to share costs and

skills to exploit fast-changing opportunities.

The NIIIP Consortium will deliver iterations

of a reference architecture, software toolkits

that are the building blocks of an instantiated reference architecture, research prototypes, and pilot demonstrations. In accomplishing these deliverables, NIIIP will adopt and converge existing standards and

technology from STEP, the Object Manage- ment Group (OMG), the Internet Society, and the Workflow Management Coalition.

NIST efforts enable improved engineering

practices. Advanced communication capabilities for distributed computing resources

are being applied to allow for transparent

access to distributed resources, including shared data representations. Additionally, workflow management technology will be

exploited to expedite the engineering process. NIST research has focused on the integration of STEP technology and standards, while object-oriented technology and standards emerge from OMG. The project is premised on the adoption of STEP Data Access

Interface (SDAI) as an international standard. This project will validate the proposal

for an SDAI/IDL (Interface Definition

Language) binding. NIIIP plans to develop,

demonstrate, and transfer this technology

into widespread industrial use.

Contact:

Katherine Morris

(301) 975-3081

email: katherine.morris@nist.gov A127 Metrology Building

PRODUCT DATA

EXCHANGE STANDARDS

FOR MANUFACTURING

The goal of this activity is to accelerate the development and deployment of product

data standards to enable the sharing and

reuse of design, engineering, and manufacturing information. The strategy is to work

with industry to translate its requirements

into standards, principally International Organization for Standardization (ISO) 10303 (Product Data Representation and

Exchange), to validate these standards and

then to pilot test these standards in an industrial setting. World-wide interest in ISO

10303, also known as STEP, is motivated by

industry's desire to achieve critical operational and strategic capabilities. STEP:

• enables a number of improved product

development strategies such as concurrent

engineering, enterprise integration, and electronic commerce;

• facilitates companies working together as

a virtual enterprise on product development; and

• makes possible the use of better approaches to increase efficiency and reduce time to market in developing new or improved products.

Initial implementations of this international standard are by vendors of computeraided design (CAD) systems. Each CAD

system's unique proprietary format inhibits

the direct exchange of information among

various manufacturing processes.

NIST is assisting industry by facilitating standards development and addressing feed- back from validation and implementation

activities. The initial STEP standard is capable of conveying existing CAD model representations. Additional capabilities are being

developed to address other manufacturing

applications. NIST is accelerating this work

by providing an environment that supports and advances efforts to improve the effi- ciency and quality of these specifications. An

integrated suite of software tools is being

established that will interact with the STEP

registry at NIST, which contains STEP specifications, related documents, and representative data. This suite will provide

"intelligent" access to any part of these refer- ences and to generated aspects of the docu- ments that do not require application

domain knowledge.

To achieve widespread adoption of these

standards, industry must understand the

benefits and understand how to manage the

risks associated with adopting this new technology. NIST currently is working with the automotive industry on the AutoSTEP pilot

project, in which STEP is being used to exchange design and part data between suppliers and original equipment manufacturers. NIST is providing its expertise on

requirements analysis, testing methods, and

STEP technology. In addition, NIST supplies

a neutral site for Internet communications

between pilot members. The goal is to docu- ment the benefits of using STEP within the

context of supply chain business scenarios.

Contact: Jim Fowler

(301) 975-3180

email: james.fowler@nist.gov A127 Metrology Building
MANUFACTURING ENGINEERING LABORATORY

STEP CONFORMANCE AND

INTEROPERABILITY

TESTING

The STEP (Standard for the Exchange of Product Model Data) conformance testing

project is sponsored jointly by the NIST Sys- tems Integration for Manufacturing Applications Program and Navy ManTech. The

technical goal is to provide an objective means of evaluating a software system for

its ability to meet the requirements of STEP, an international standard (officially International Organization for Standardization 10303) developed to let companies effectively exchange design and

engineering information with their customers and suppliers as well as internally. The

initial customers of the project results are developers of computer-aided engineering

systems and product data management

systems.

Experience with complex standards has shown that claims of compliance with a standard often are unreliable. When imple- mentations of a standard do not meet

requirements, adoption of the standard can

be delayed or prevented. The primary focus

of this effort is the development of software

tools and methods for assessing whether new

software applications comply with the standard. The tools need to be extensible to accommodate the expanding set of applications supported by STEP. This project lever- ages earlier work done by NIST on EXPRESS,

the formal description language used to

specify STEP and STEP Class Library tool

kits.

NIST has formed alliances with the Industrial Technology Institute, PDES Inc., and

the Automotive Industry Action Group

industrial organizations driving the develop- ment and application of STEP. NIST and its industrial partners have initiated a beta test- ing program to give vendors early access to STEP testing tools during product develop- ment. This allows them to become familiar with the tools, gain confidence that their product can successfully pass testing, and

use the tools to improve the quality of their products. Vendors also gain from the expanded market brought on by increased user confidence in tested products. The same

tools also can be employed by end users to

assess the ability of these products to intemperate in a specific industrial context, further expanding the market for standards-based

products.

This approach provides an infrastructure for an efficient conformance testing program, which will help open world markets to U.S.- developed STEP products. In concert with

these activities, NIST is aggressively partici- pating in international standards efforts

related to conformance testing and product

certification.

Contact: Simon Frechette

(301) 975-3335

email: simon.frechette@nist.gov A127 Metrology Building

MANUFACTURING

RESOURCE DATA

REPRESENTATION

The NIST manufacturing resource data rep- resentation project is a continuation of prior

efforts carried out under the rapid response manufacturing intramural project. This

project is designed to establish information models that specify a common and stand- ardized electronic representation for manufacturing resource data. This representation proposes a structure for the classification and characteristics of machine tools, cutting

tools, tool holders, cutting inserts, and other

resources. Project results provide a catalyst

for a standardized manufacturing resource data structure.

Standards activities have been initiated through both International Organization

for Standardization (ISO) and American

National Standards Institute. Current efforts are to facilitate standardization and imple- mentation of the proposed data structure, lead U.S. efforts for standardization of cut- ting tool data through the ISO TC29/WG34

standards group, and facilitate liaison be- tween ISO technical committees to ensure

compatibility of standards and no duplication of effort. Impacts of this project include

the ability to share manufacturing resource data among manufacturing applications,

easier effort for maintenance of resource data and industry databases, direct import of manufacturing resource vendor data into customer applications, and a standardized

structure for electronic tooling catalogs.

Contact: Kevin K. Jurrens

(301) 975-5486

email: kevin.jurrens@nist.gov A127 Metrology Building
MANUFACTURING ENGINEERING LABORATORY

PROCESS SPECIFICATION

LANGUAGE

NIST research in the definition of a neutral

representation of product data, most

recently realized through STEP (Standard

for the Exchange of Product Model Data), has resulted in real benefits for U.S. manufacturing industry. Like product data, process data also is used throughout the life

cycle of a product, from early assessment of

process options, through process planning,

production scheduling, and control. In addition, the notion of process underlies the

entire manufacturing cycle, coordinating

the workflow within engineering and manufacturing. The goal of the Process Specification Language (PSL) project is to create a neutral process representation that would

facilitate process data sharing among vari- ous applications because they would all "speak the same language," either as a second language or as their native language.

What makes this work unique is its focus on

the semantics, or meanings, of the elements

of the language. With the growing complexity of information and the increasing need

to completely and correctly exchange process information among different disciplines,

the need for unambiguous capture of the meaning of concepts within the given repre- sentations is becoming more apparent. The

PSL will consist of a formal semantic under- pinning upon which multiple presentations can be mapped, ultimately enabling the automated exchange of process information

within a manufacturing enterprise, or even

within a supply chain enterprise.

Contact: Amy Knutilla

(301) 975-3514

email: amy.knutilla@nist.gov A127 Metrology Building

RESEARCH

FACILITIES

NATIONAL ADVANCED

MANUFACTURING TESTBED

Through the National Advanced Manufacturing Testbed (NAMT) research program, a distributed testbed built on a state-of-the-art, high-speed computing and communications

infrastructure has been developed. The test- bed is enabling scientists and engineers from industry, NIST, academia, and other government agencies to work collaboratively

to solve measurement and standards issues

that impede companies and industries from making the most of their information

technology.

The NAMT testbed has geographically distrib- uted partners and emphasizes virtual tech- nology to support collaborative research on

standards for information-based manufacturing. The equipment, expertise, and capabilities of NAMT partners are electronically connected through the testbed's common

infrastructure. Moreover, collections of

resources and personnel can be easily configured—and reconfigured—in response to changing research needs and

objectives. The virtual technology elements

of the testbed support research on applications of simulation and modeling methods

that are essential to rapid prototyping and

fast fabrication, among a host of other key

capabilities. Work at the NAMT is devoted

not only to developing and validating models and simulations of individual processes, but also to ensuring the integrity and accuracy of computerized representations of

the performance of entire manufacturing

systems.

The NAMT infrastructure supports real-time

interactions among collaborators and real- time access to hardware and software. It integrates voice, video, and data on the same

network to create a cohesive collaborative environment. Today, in contrast, organizations use separate networks dedicated to particular uses, such as telephone networks for

voice communication, packet-switching net- works for data transmission, and closed circuit television for videoconferencing.

Information technology resources available

to NAMT partners include the following:

• physical communications components

such as networking gateways, routers, and

networking software that provide collaborators with access to equipment, documents,

databases, project information, test data, and testing suites;

• commercial and experimental software

applications, such as design, engineering,

and simulation packages;

• multimedia communications such as videoconferencing, groupware, and email

exploders to facilitate effective collaboration among remotely located partners, as well as

security and safety mechanisms;

• advanced machine tools and research equipment that might otherwise be unavailable to collaborators; and

• vast and varied technical expertise that is immediately accessible through the national

network.
MANUFACTURING ENGINEERING LABORATORY -j

An innovation in research collaboration, the NAiMT aims to speed development of a critically needed information infrastructure for

U.S. manufacturing. Cooperation, collaboration, and consensus are essential to building

this key requirement for future manufacturing competitiveness. The NAMT has a strong foundation of research partners from industry, other government agencies, and the aca- demic community', and new opportunities

for collaboration are continuously being

explored.The NAMT accommodates different

levels of partnership through both formal and informal arrangements. Included among the many ways in which partnership can exist are cooperative research and

development agreements, guest researcher agreements, memoranda of understanding,

the NIST Industry Fellows Program, contracts, and participation in NAMT-hosted

technical workshops. Interested organizations and prospective partners are encour- aged to learn more by visiting the NAMT web

page at www.mel.nist.gov/namt/nam2.htm.

Contact: David Stieren (301) 975-3197

email: david.stieren@nist.gov A327 Metrology Building

ACOUSTIC ANECHOIC

CHAMBER FACILITY

This facility is a vibration-isolated, shell- within-shell structure that is one of the

quietest and best acoustically characterized rooms in the world. The inner room is supported by 52 coil springs and has walls

0.3 m thick. All interior surfaces are covered

with custom-designed wedges that protrude

into the room about 1.8 m. The inner room

is 6.7 m wide, 10 m long (wedge tip to wedge tip), and 6.7 m high. The walls are designed to be 99-9 percent sound-absorptive

over frequencies above 45 Hz. The ambient

noise in the chamber is so low it cannot be measured above a few hundred hertz with

the best quality laboratory microphones.

APPLICATIONS

Acoustical measurements under free-field conditions are performed in the chamber.

Research done in the chamber supports standards development, improved measure- ment methods, and sensor development. Measurement services are provided to a broad range of industries and government

agencies. In addition, the chamber has been

used to support the development of a wide

range of transducers, including advanced

loudspeakers and hearing aids, micro- machined silicon microphones, and sonar

arrays prior to sea trials.

Contact:

Victor Nedzelnitsky

(301) 975-6638

email: victor.nedzelnitsky@nist.gov A147 Sound Building

MASS STANDARDS

FACILITY

Dedicated to mass research and development

this facility consists of a class 1000 clean room with temperature control to within

0.1 °C in the range of 20 °C to 22 °C, temperature gradients of less than 0.1 °C/m, and relative humidity control to within ± 2 percent in the range of 45 percent to 50 percent. Additional environmentally

controlled laboratories are dedicated to mass measurements in the range 1 mg to 27 200 kg.

APPLICATIONS Research and development activities include

the characterization of physical and chemical properties of artifact mass standards and

support of research efforts aimed at monitoring the mass unit by means of fundamental

constants. Mass measurement services also

are provided.

Contact: Zeinajabbour

(301) 975-4468

email: zeina.jabbour@nist.gov A147 Sound Building
MATERIALS SCIENCE AND

ENGINEERING LABORATORY

The Materials Science and Engineering

Laboratory provides technical leadership

and participates in developing the meas- urement and standards infrastructure

related to materials critical to U.S. industry, academia, government, and the public. Materials science and engineering programs at NIST cover a full range of materials issues from design to processing

to performance. A unifying aim is to acquire the knowledge and tools needed

for intelligent manufacturing methods

with real-time automated process controls.

Separate research initiatives address ceramics, metals, polymers, composites,

and superconductors. This research supports efforts of U.S. industry to develop

reliable, low-cost manufacturing methods

for producing tailor-made materials and

products with superior properties.

Through laboratory-organized consortia and one-to-one collaborations, NIST's

materials scientists and engineers work

closely with industrial researchers. Examples include work on improved processing

of rapidly solidified metal powders, poly- mer composites, ceramic machining,

aerospace alloys, and non-destructive evaluation sensors for aluminum and

steel manufacturing. The laboratory

also is strengthening its relationships with manufacturers of high-technology

products, the major users of advanced

materials.

Contact:

Leslie E. Smith, Director (301) 975-5658

email: leslie.smith@nist.gov

fax: (301) 975-5012 B309 Materials Building

www.msel.nist.gov

COOPERATIVE RESEARCH

OPPORTUNITIES

Advanced Materials Programs

127 Ceramic Coatings 127 Dental and Medical Materials 128 Electronic Packaging, Interconnection, and Assembly

128 Evaluated Materials Data 128 High-Temperature Superconductivity 129 Magnetic Materials 129 Mechanical Properties of Brittle Materials 130 Polymer Characterization

131 Thin-Film Measurements and

Standards

Advanced Processing Programs

131 Ceramic Machining 132 Ceramic Processing 132 Intelligent Processing of Materials 133 Metals Data and Characterization 133 Metals Processing 134 Polymer Blends and Processing 134 Polymer Composites

135 Ultrasonic Characterization of Materials

RESEARCH FACILITIES

136 NIST Center for Neutron Research 140 Materials Science X-ray Beamlines 140 Center for Theoretical and

Computational Materials Science

141 Magnetic Engineering Research

Facility 142 Small-Angle X-ray Scattering Facility 142 Powder Characterization and

Processing Laboratory

ORGANIZATIONAL STRUCTURE

MSEL is separated into five divisions. Contacts for each division are listed below.

Ceramics Division

Contact: Stephen W. Freiman

(301) 975-6119

email: sfreiman@nist.gov

fax: (301) 975-5334 A256 Materials Building

www.ceramics.nist.gov

Materials Reliability Division

Contact: Harry I. McHenry

(303) 497-3268

email: mchenry@boulder.nist.gov

fax: (303) 497-5030

Mailcode 853-00

Boulder, Colo. 80303-3328

www.boulder.nist.gov/div853

Metallurgy Division

Contact:

Carol A. Handwerker

(301) 975-6158

email: carol.handwerker@nist.gov

fax: (301) 975-4553 B26l Materials Building

www.metallurgy.nist.gov

Polymers Division

Contact: Bruno M. Fanconi

(301) 975-6769

email: bruno.fanconi@nist.gov

fax: (301) 975-3928 A309 Polymer Building

www.msel.nist.gov/structure/polymers.html

NIST Center for Neutron Research

Contact:

J. Michael Rowe

(301) 975-6210

email: mike.rowe@nist.gov

fax: (301) 869-4770 A106 NIST Center for Neutron Research

http://rrdjazz.nist.gov

;
MATERIALS SCIENCE AND ENGINEERING LABORATORY -|

COOPERATIVE RESEARCH

OPPORTUNITIES

ADVANCED MATERIALS

PROGRAMS

CERAMIC COATINGS

The ceramic coatings program is a measure- ment and characterization effort that addresses the processing reproducibility and

performance prediction issues that are primarily associated with thermal-spraydeposited ceramic coatings. The program

focuses on plasma-spray-deposited ceramic

thermal barrier coatings used in aircraft gas

turbines and expected to be used in land- based turbines and diesel engines. Sales in

the thermal-spray industry currently are valued at more than $1 billion annually, a

significant portion of which is ceramic

thermal-barrier coatings.

Collaborations have been established with

industrial organizations including Pratt &

Whitney, General Electric Co., Caterpillar,

Inc., Metco, MetTech, Inc., and Zircoa, Inc.,

as well as the Thermal Spray Laboratory at

the State University of New York at Stoney Brook and the Thermal Spray Laboratory at Sandia National Laboratory. The program

includes collaboration with the National

Aerospace Laboratory and the National Mechanical Engineering Laboratory, both

in Japan, to examine functionally gradient

materials. Collaboration also is underway

with Bundesanstalt fur Materialforschung

und-priifung (Germany) for the develop- ment of characterization techniques for

thin, hard films. Research is conducted on

the processing and properties of physicalvapor-deposited ceramic coatings in collaboration with Praxair.

The approach taken in the plasma-spray

(PS) research has been to build on the analytical capabilities at NIST and the material

processing capabilities of collaborators. This program tackles the following technical

challenges:

• measurement of the physical and chemical properties of stabilized zirconia and

tungsten carbide feedstocks;

• determination of the quantity, size, and

orientation of porosity and microcracks in PS ceramic coatings suitable for use in modeling the thermomechanical behavior of these materials;

• development of methods to measure

chemical, elastic modulus, and thermal

properties on a scale suitable for use in microstructural models of behavior;

• development of techniques to model ther- momechanical behavior of thermal-barrier

coatings to enable more reliable perform- ance prediction;

• development of techniques for accurate measurement of the thermal conductivity of PS coatings by use of the guarded hot-plate

technique; and

• development and refinement of more sensitive methods for accurate analysis of oxide phases and residual stresses, which affect performance and durability of coatings.

Contact:

Stanley J. Dapkunas

(301) 975-6119

email: stanley.dapkunas@nist.gov A256 Materials Building

DENTAL AND MEDICAL

MATERIALS

The dental and medical materials program

provides basic materials science, engineering, test methods, and standards to sectors of the health-care industry for the development

of new or improved materials and delivery systems. The focus of this program is the development of improved dental restorative materials with greater durability, wear resistance, and clinical acceptability.

Dental restorative composites are hetero- geneous materials having three essential phases:

• a polymeric matrix that comprises the continuous phase;

• fillers of various types, sizes, shapes, and

morphologies that constitute the disperse

phase; and

• an interfacial phase that, in varying

degrees, bonds the continuous and disperse

phases into a unitary material rather than a simple admixture.

While all three phases are important in determining the properties of the composites, this program is focused primarily on

the interfacial and polymer matrix phases. Since the polymerization shrinkage that occurs in the matrix phase is one of the most commonly cited deficiencies of dental

restorative composites, resources are allo- cated to develop high conversion, durable, low shrinkage polymeric materials for use in dental resin and composite applications.

Although only a minor component of these composites, the interfacial phase that devel- ops from the interaction of the silane coupling agent with the polymer matrix and the

siliceous filler exerts a profound effect on

the properties of the composites. Because

these composites are used in an aggressive, aqueous environment that constantly chal- lenges the vulnerable silane mediated polymer-filler bond, understanding of this

critical interfacial phase is being acquired
128 MATERIALS SCIENCE AND ENGINEERING LABORATORY

so that strategies can be developed for its improvement.

The occupational and environmental hazards associated with the use of mercurycontaining dental alloys also are being

addressed through the development of substitute materials with similar physical properties. This project is focused on acid-assisted consolidation of chemically precipitated silver powders and property measurements of hand-consolidated test compacts prepared

with the tools and procedures normally

employed by dentists. Wear and biocompatibility studies on the hand-consolidated compacts are in progress.

Contact:

Francis Wang

(301) 975-6726

email: francis.wang@nist.gov A143 Polymer Building

ELECTRONIC PACKAGING,

INTERCONNECTION, AND

ASSEMBLY

MSEL has developed a program committed

to addressing the U.S. microelectronics

industry's most pressing materials measure- ment and standards issues, which are central to the development and utilization of advanced materials and material processes within new product technologies. This pro- gram embraces the following objectives:

• development and delivery of standard measurements and data;

• development and application of in situ measurements on materials and material

assemblies having micrometer- and

submicrometer-scale dimensions;

• quantification of the divergence of material properties from their bulk values as dimensions are reduced and interfaces are approached; and

• development of a fundamental understanding of materials needed for future packaging, interconnection, and assembly

schemes.

With these objectives in mind, the program

presently consists of nearly 20 separate projects that examine key materials-related

issues: electrical, thermal, and mechanical

characteristics of polymer and metal thin

films; solders, solderability and solder joint

design; interfaces and adhesion; electromigration and stress voidage; and built-up

stress and moisture in plastic packages. These projects always are conducted in concert with partners from industrial consortia, individual companies, academia, and other government agencies. The program is coupled strongly with other microelectronics programs within government and industry,

including NIST's National Semiconductor

Metrology Program, a national resource

responsible for the development and dissemi- nation of new semiconductor measurement

technology.

Contact: Wen-Li Wu

(301) 975-6839

email: wen-li.wu@nist.gov B320 Polymer Building

EVALUATED

MATERIALS DATA

The objective of the evaluated materials data program is to develop and facilitate the use of evaluated databases for the materials

science and engineering communities. Both

research- and application-directed organizations require readily available evaluated data to take advantage of the large volume

of materials information developed on publicly and privately sponsored programs. This

information, particularly numeric data, is available in an ever-increasing number of publications published worldwide. The

necessity to consolidate and allow rapid comparison of properties for product design and

process development underlies the database

projects.

Evaluated databases are developed in cooperation with the NIST Standard Reference Data Program and often coordinated with

the activities of other laboratories and scientific or technical societies. Research consists

of the compilation and evaluation of numeric data as well as recently initiated

efforts directed at more effective distribution and use of data. Database activities reflect laboratory programs with scientific capabilities required for appropriate data evaluation.

Database projects in MSEL include the fol- lowing: Phase Diagrams for Ceramists, in cooperation with the American Ceramic

Society; the Structural Ceramics Database

for nitrides, carbides, and oxides; a ceramic

machinability database; a high-Tc superconductivity database; and the NACE/NIST

Corrosion Performance Database. The associ- ated Crystal Data Center provides fundamental crystallographic data on inorganic

materials.

Contact:

Stanley J. Dapkunas

(301) 975-6119

email: stanley.dapkunas@nist.gov A256 Materials Building

HIGH-TEMPERATURE

SUPERCONDUCTIVITY

A significant program in high-Tc (critical

transition temperature) superconductivity is being conducted in MSEL and other Meas- urement and Standards Laboratories at NIST. The primary focus of the MSEL pro- gram is on bulk superconducting materials

for wire and magnet applications. In carry- ing out this program, researchers in MSEL

work closely with their counterparts in other NIST laboratories and collaborators in U.S.

industry, universities, and other national

laboratories.
MATERIALS SCIENCE AND ENGINEERING LABORATORY i 2 g

The program has four primary thrusts:

• the development of phase diagrams for unique ceramic materials;

• characterization of the effects of strain on

loss of current in superconducting wires;

• examination of flux pinning in materials; and

• the use of thermal neutron scattering

techniques and profile refinement analyses

to investigate crystal and magnetic structures, composition, dynamics, and crystal chemical properties.

Contact: Stephen W. Freiman

(301) 975-6119

email: stephen.freiman@nist.gov A256 Materials Building

MAGNETIC MATERIALS

The focus of the magnetic materials pro- gram is the development of the measure- ment science needed to characterize the

1 properties and performance of new magnetic

materials. Proper measurements of key magnetic properties, determination of the funda- mental science behind the magnetic

behavior of these new materials, analysis of

i the durability and performance of magnetic

devices, and development of Standard Referj ence Materials are key elements of this program. Of particular interest is understanding the magnetic behavior of low- dimensional systems, in which one or more

characteristic dimensions have been reduced

to nanometer sizes. Areas of present study

include the following:

• processing of magnetic multilayers for optimal giant magnetoresistance effect;

• observation and micromagnetic modeling

of magnetic domains for understanding

magnetization statics and dynamics in

. advanced and conventional materials;

• measurement and characterization

of nanoscale magnetic interactions in

multilayers, nanocomposites, and low- dimensional systems, needed for understanding and applying the new physics of these materials;

• measurement and modeling of the enhanced magnetocaloric effect in nanocomposites;

• structure and magnetic characterization

of new superconducting materials;

• nanotribology (measurement of stiction,

friction, and wear at the nanometer scale)

of magnetic hard disks;

• measurement and understanding the ori- gin of magnetic exchange bias in conventional and advanced magnetic structures and devices;

• development of magnetic sensors of mechanical properties for incorporation as

in situ controls in a steel mill; and

• development of a measurement system

for the preparation of an absolute magnetic

moment standard.

By experimentally addressing important

issues in magnetism, by bringing together

the industrial and scientific communities

through the organization of workshops and

conferences in the area, and by the develop- ment and preparation of appropriate standards, NIST acts to accelerate the utilization

of advanced magnetic materials by the

industrial sector and to enable industry

to take advantage of new discoveries and

innovations.

Contact: Robert D. Shull

(301) 975-6035

email: robert.shull@nist.gov B152 Materials Building

MECHANICAL

PROPERTIES OF BRITTLE

MATERIALS

Mechanical properties are the source of the

greatest benefits as well as the most severe

limitations of ceramic materials. Owing to

their high strength-to-weight ratio, their

relatively inert behavior in aggressive envi- ronments, their high hardness and wear

resistance, and their ability to withstand

significantly higher temperatures than metals or polymers, ceramics offer the potential

for major improvements in component

design for a wide range of applications. On

the debit side, however, ceramic materials

typically exhibit statistically variable brittle

fracture, environmentally enhanced subcritical crack growth, sensitivity to machining

damage, and creep/deformation behavior at

elevated temperatures. Additionally, a lack

of techniques that can detect and quantify

critical flaws before failure ensues severely

curtails current uses of ceramics. Unpredictable failure behavior of ceramics stems from three sources:

• limited data and a deficiency of basic understanding of failure processes in ceramics;

• limited standard test techniques to permit

interlaboratory comparisons of materials behavior and collection of engineering data; and

• inadequate models and statistical tech- niques for life prediction and reliability

analyses. The mechanical properties of brittle materials program has components specifically addressing each of these issues.

Basic understanding of the mechanical

behavior of ceramics is investigated at both room temperature and elevated temperatures. At room temperature, mechanical

properties and failure processes are investi- gated in fiber-reinforced ceramic matrix

composites as a function of microstructural

scale and in aluminum nitride substrates as

a function of processing conditions, phase
MATERIALS SCIENCE AND ENGINEERING LABORATORY

content, and microstructure. Microstructural stresses related to enhanced fracture toughness are measured via micro-Raman

techniques in heterogeneous microstructures and correlated with micromechanical

modeling. Micromechanical computer

simulations are used to elucidate distributions of residual stress distributions in highly anisotropic ceramics as a function of crystallographic texture. At elevated temperatures, the basic mechanisms responsible for crack growth, creep, and creep rupture are investigated for various silicon nitride compositions and for membrane and fuel cell

materials.

To improve interlaboratory comparisons and to increase confidence in generated

data, new standard test techniques for hardness and toughness are being developed and

tested in round-robin experiments. Research and interlaboratory studies in instrumented

indentation address the use of this tech- nique for measuring elasticity and hardness

of thin films and coatings. Micro-Raman

techniques are being developed and cali- brated so that quantitative assessments of microstructural residual stresses can be mapped for heterogeneous microstructures.

At elevated temperatures, new creep speci- mens that permit higher stresses with reduced non-gage section failures were

designed. Intra- and interlaboratory studies demonstrated the robustness of these geometries. International interlaboratory studies

are under way to elucidate their relationship

to alternate testing geometries.

Finally, techniques to predict lifetimes of ceramics under constant and variable load- ing conditions are being developed. A nonparametric bootstrap approach for assessing

the confidence of lifetime predictions is investigated and compared with analytical

techniques. Work includes applying these techniques to aluminum nitride materials

for thermal management systems and to fused silica and other glasses for spacecraft

window applications. A new experimental

procedure was developed for characterizing

time-dependent failure under static loads.

Contact: Edwin Fuller

(301) 975-5795

email: edwin.fuller@nist.gov A329 Materials Building

POLYMER

CHARACTERIZATION

The polymer characterization program provides measurement methods, data, and

Standard Reference Materials needed by U.S.

industry, research laboratories, and other

federal agencies to characterize polymers for

processibility, rheological and mechanical

properties, and performance. Molecular mass and its distribution have significant

effects on the processibility of polymers

through dramatic effects on their rheological properties. Mechanical properties and

performance are affected significantly by the

solid-state structure formed during processing. Importantly, unlike many other com- mon engineering materials, polymers have mechanical properties that exhibit time- dependent viscoelastic and aging behaviors, even at low temperatures. As a result, the focus of the program is on techniques that measure molecular mass distributions, solidstate structures, mechanical properties, and

rheological behavior of polymeric materials.

Primary methods employed for molecular mass characterization are dilute solution

light scattering and osmometry. Chromatographic techniques, which require calibration by standards of known molecular mass,

provide information on molecular mass distribution. Recent activities exploit advances

in mass spectrometry using matrix-assisted

laser desorption ionization to develop the method as a primary tool for the determination of the molecular masses of synthetic

polymers. Solid-state structure of polymers

is elucidated using small- and wide-angle

X-ray scattering, atomic force microscopy, and electron microscopy, as well as spectro- scopic methods such as solid-state nuclear magnetic resonance and infrared

spectroscopy.

Adequate characterization of the time- dependent viscoelastic and aging behaviors

of polymers requires large amounts of testing. For this reason, methods are developed

that reduce the number of tests required to describe the non-linear thermo-viscoelastic

properties of polymers. The approach applies the frameworks of solid and fluid contin- uum mechanics to interrelate mechanical

responses under different geometries of deformation and in varied deformation

histories. Phenomenological models and

underlying physical theories are tested using

the NIST torsional dilatometer, conventional rotational rheometry, and servo- hydraulic mechanical testing machines.

The polymer industry and standards organizations assist in the identification of current needs for Standard Reference Materials. Based on these needs, research on characterization methods and measurements is conducted leading to the certification of Standard Reference Materials. Molecular

standards are used primarily for calibration

of gel permeation chromatographs, the principal method employed by industry for

assessing molecular mass and molecular mass distributions. Melt flow standards are used in the calibration of instruments used

to determine processing conditions for ther- moplastics. Rheological standards are developed for secondary calibrations of rheological instruments in industry and

academia.

Contact: Bruno M. Fanconi

(301) 975-6769

email: bruno.fanconi@nist.gov A309 Polymer Building
MATERIALS SCIENCE AND ENGINEERING LABORATORY

i 31

THIN-FILM

MEASUREMENTS AND

STANDARDS

Functional ceramics (that is, ceramics pri- marily intended for optical, electronic, or thermal management applications) are increasingly being used in film geometries.

In response to this growing segment of the ceramics community, the thin-film measure- ments and standards program endeavors to provide improved measurement tools and

data that are needed to evaluate advanced

ceramic films and film systems. Increasingly critical film performance require- ments (such as reduced dimensions,

increased purity, improved interface properties, increased production rates, and tighter control of properties) place stringent

demands on film processing control, models, and characterization techniques. However, lack of measurement methods to monitor film processing and accurately

characterize film properties as well as limited theoretical understanding of interrela- tionships between processing conditions and

final film properties reduce most film processing to empirical procedures. The activities in this program are designed to address

these measurement and modeling issues, both with regard to specific, near-term

industrial needs as well as to the develop- ment of a materials science knowledge base

required for use of ceramic films in future

applications. Near-term and long-range

goals have been developed based upon both

. general discussions between MSEL staff and

representatives of industry and universities

at professional meetings and consortia workshops as well as focused, collaborative research projects with specific organizations.

The film characterization techniques in use or under development include electrical, mechanical, optical, thermal, and X-ray measurements. Specific research activities include the following:

• investigations of the processing and

microstructural features that control poling behavior and domain stability in ferroelectric films;

• development and utilization of spectro- scopic procedures to evaluate film composition in BaTi03 and to detect defects in

ferroelectric and semiconductor films;

• development of methods to measure and

statistically analyze texture and texture dis- tributions in films and to relate these data to processing conditions;

• development of measurement procedures,

models, and standards to permit quantitative evaluation of thermal diffusivity in thin

films and to relate thermal diffusivity to film microstructure and morphology; and

• application of advanced X-ray measure- ment capabilities (such as EXAFS and DATS)

to the analysis of film structure and composition and the construction of an in-house

state-of-the-art X-ray facility.

A critical requirement of the projects cited above has been the ability to generate model

film systems. To this end, this program

includes two film deposition capabilities: metallorganic vapor deposition and pulsed

laser deposition.

Contact: Grady White

(301) 975-5752

email: gwhite@nist.gov A215 Materials Building

ADVANCED PROCESSING

PROGRAMS

CERAMIC MACHINING

The ceramic machining program was established in response to a comprehensive sur- vey of the U.S. advanced ceramics industry

indicating that the high cost of machining

and, at times, uncertain reliability associ- ated with machining damage are primary

impediments to the widespread use of these materials. This program is designed to address generic industry needs related to measurement methods and standards in order to assist industry in the development

of machining technology for the manufacture of reliable and cost-effective components made from advanced ceramics.

Several specific projects are under way to

study:

• effects of abrasive machining on

mechanical properties of ceramics,

• intelligent machining of ceramics,

• chemical and chemomechanical effects

of grinding fluids, and

• abrasive finishing and wear of dental ceramics.

Ceramic materials studied in these projects include those ceramics intended for structural applications, such as silicon nitride, and the ceramics used for dental restorations, such as machinable glass-ceramics.

The first two projects are conducted jointly with the 22-member Ceramic Machining

Consortium with input from NIST's Preci- sion Engineering Division, Statistical Engineering Division, and Standard Reference Data Program. The consortium members,

representing a broad spectrum of industry

including materials producers, machine

tool builders, suppliers of expendables (such

as grinding wheels and fluids), and end

users, participate by providing materials,

testing, advice, and other in-kind contributions. The consortium members also provide
MATERIALS SCIENCE AND ENGINEERING LABORATORY

input to the other two projects and assist NIST in formulating the scope of the research projects. The close working rela- tionship developed between industry, aca- demic institutions, and NIST not only ensures the relevance of the research projects but also promotes an efficient and

timely transfer of research information to industry for implementation.

Contact: Saidjahanmir

(301) 975-3671

email: sjahanmir@nist.gov A329 Materials Building

Since all subsequent operations depend on

the raw materials' characteristics, the meas- urement of the physical and chemical properties of powders is an important component

of the program. The reliability of various measurement techniques is being assessed

in a cooperative international program

under the direction of the International Energy Agency and its subtask on ceramic powder characterization. The subtask is being coordinated at NIST in the ceramic

processing program. In addition, Standard

Reference Materials needed to calibrate the measurement instruments in use are being

developed. A project that studies the mechanism of drying, using nuclear magnetic reso- nance imaging, is in progress and is providing direct insight on the moisture gradients formed during drying.

A consortium called the Ceramic Processing

Characterization Consortium (CPCC) was

formed in June 1997. Its mission is to assist

the U.S. ceramic industry in establishing a

generic, powder-processing measurements

infrastructure. The goal is to assess the measurement needs in ceramic processing

and to take all necessary and feasible

actions to find viable solutions. The members of the CPCC are volunteers from companies, instrument makers, universities, and

national laboratories. Their contributions to

the projects of the CPCC should result in rapid advances in the near future. The

current projects follow:

• powder characterization,

• green body characterization,

• moisture measurements,

• dispersion and rheology, and

• microstructure development.

Teams for each of these projects have been

formed. The reliability and reproducibility

of commonly used instruments will be

assessed, new methods will be developed,

and a better understanding of how the measured properties affect the behavior of the material at different stages of processing will

be developed through basic research studies.

All studies will be generic and nonproprietary. All members of the CPCC share

in carrying out the work in the CPCC project teams. The consortium members represent more than 60 companies, government labs, and universities.

Contact: George Onoda

(301) 975-4489

email: george.onoda@nist.gov A256 Materials Building

INTELLIGENT

PROCESSING OF

MATERIALS

Research activities in the intelligent process- ing of materials (IPM) program investigate

the conversion of materials into value-added

products using model-based control of processing variables. Information for real-time process control is provided by on-line sensors that measure material characteristics or processing conditions or both. Intelligent processing will enable industry to economically produce materials with improved quality, consistent properties, and enhanced

functionality. The IPM program makes

important contributions to two of MSEL's

three strategic thrusts: advanced materials and advanced processing.

The IPM concept is the principal approach

used to achieve the MSEL goal to "foster the development and implementation of tech- nologies for advanced processing of materials." IPM has three central elements:

• process understanding expressed in terms

of a process model,

• real-time information on processing

parameters and material condition obtained

with on-line process sensors, and

• a model-based sensing and control strat- egy to achieve the desired characteristics in

the finished product.

CERAMIC PROCESSING

Ceramic products are primarily produced by

powder processing, where raw material powders are mixed with forming additives and

shaped by various means into green bodies, which then are fired to the final, hardened

state. The processing costs can vary greatly depending on the reproducibility and reliability of the process operation. One key to

reliable and rapid development of new products is having good test methods to analyze

the material at its different stages of processing. Unfortunately, no satisfactory measure- ment infrastructure yet exists within the ceramics industry, and, as a result, much

processing relies largely on art and

experience.

The program on ceramic processing focuses on the development and improvement of measurement methods of generic value to

all ceramic companies. Clearer definitions

are needed as to what needs to be measured,

how is it to be measured, and how reliable is

the measurement. Also, the value of the measurement to optimizing the processing

operations is needed.
MATERIALS SCIENCE AND ENGINEERING LABORATORY -j

IPM projects advance each of these ele- ments, and joint projects with industry are integrating these elements into improved

processing capabilities.

The IPM program is an important contributor to the MSEL goal to "foster the use of advanced materials in commercial products." Advanced materials are materials with

microstructures designed and controlled to provide superior properties and performance

for specific functions. Microstructural

control is perhaps the most important appli- cation of IPM. The idea is to model microstructural evolution during processing, sense microstructural changes in real time, and use a model-based control strategy to achieve the desired microstructure in the fin- ished product. Microstructural consistency is

essential to the commercialization of advanced materials because it ensures

reliable properties and performance of the material.

The IPM program also contributes to MSEL's measurement technology goal. A major focus of the IPM projects is process

sensors, which industrial collaborators

repeatedly identify' as a crucial need. Sensor

technology is a core competence of MSEL,

which has its roots in sensor development

for non-destructive evaluation of materials. Unique MSEL capabilities are being used to measure thermophysical properties at ele- vated temperatures; these data are combined

with model enhancements and then incorporated in industrial software for metal casting. In addition, specialized measurement

capabilities such as nuclear magnetic reso- nance and small angle neutron scattering

are used to understand microstructure/morphology evolution in ceramics and polymers.

Contact: Tom Siewert

(303) 497-3523

email: siewert@boulder.nist.gov Mailcode 853-07

Boulder, Colo. 80303-3328

METALS DATA AND

CHARACTERIZATION

The performance of metals during use and

their behavior during processing can be understood and predicted only with the availability of a detailed body of information on

their physical properties and microstructure. The value of this information is greatly enhanced if it is developed within the context of models or theories that describe how

the measured properties of a metal will vary with changes in composition, microstructure, temperature, geometry, or other parameters. The metals data and characterization program includes activities that

refine the technology for measuring the

properties and behavior of metallic materials and that correlate these properties and

behavior to alloy microstructures.

The large majority of metals are used in applications based on their mechanical

properties, with other applications based on

electronic, magnetic, optical, or other functional properties forming smaller but nonetheless critical markets. Whatever the

application, satisfactory long-term perform- ance of metallic components demands

chemical and microstructural stability, sometimes in the presence of harsh environ- ments. This program identifies those processing, microstructure, and properties characterizations that are critical to U.S. industry for both the processing and the per- formance of metals and carries them out within the context of the NIST mission of providing data and standards. A significant

part of the program is the use of advanced

microscopy techniques to characterize the microstructures that form the basis of the measured properties.

Contact: Robert J. Schaefer

(301) 975-5961

email: robert.schaefer@nist.gov B26l Materials Building

METALS PROCESSING

The properties of metals and their alloys depend strongly on their processing history. For example, the distributions of phases,

grain structure, alloy compositional segregation, and defects in final commercial products depend on the conditions under which

materials are processed and fabricated. These distributions in turn are crucial in determining the alloy strength, ductility, homogeneity, and other properties important for industrial applications. The metals

processing program focuses on measure- ments and predictive models needed by

industry to design improved processing conditions, provide better process control, develop improved alloy and coating properties, tailor material properties for particular

applications, and reduce costs.

Major successes in applying measurements and modeling to processing applications have been achieved in interactions with the aerospace, powder metallurgy, electroplating, and electronics industries. Predictive models for solidification and microstructural evolution during processing have been

incorporated by industry into design systems

for casting aerospace alloys and producing

defect-free electronic materials, helping to reduce rejection rates arising from defective

parts. Cooperative research and development

projects with industry have resulted in sig- nificant improvements in process control for atomization of steel and superalloy powders. Standard Reference Materials certified for coating thickness, microhardness, or chemical composition are being fabricated by

electrodeposition techniques and powder

metallurgy. Critical mechanistic, chemical, and process variables controlling the struc- ture/property relationships of coatings and

thin films produced by electrodeposition are being developed to take further advantage of

this electrochemical process, which does not

require high-purity starting materials and is

readily adaptable to large-scale production.
MATERIALS SCIENCE AND ENGINEERING LABORATORY

There are three kinds of measurements and

predictive models for processing being pur- sued in this program.

• Measurements and models are developed

to help design materials production processes, such as measurements and evaluations to provide alloy phase diagrams,

which are the roadmaps that alloy designers use to predict the alloy phases that can be produced under specific processing conditions. These evaluations are playing key

roles in NIST collaborations with industrial consortia on electronic solders and casting

of superalloys for aerospace applications.

• Measurements are made under dynamic

conditions to monitor, in real time, properties of materials while they are actually

being produced and to determine difficult- to-measure process parameters while the process is occurring. Special fast-response

sensors, simulations, and imaging tech- niques have been developed for application

to powder atomization and thermal spray

processes, and workshops have been held to

transfer these techniques to industry.

Dynamic models of the process are important both for design of manufacturing

procedures and for applications of real time

feedback and control.

• To evaluate the adequacy of process models, it is important to measure the properties

of the final materials and relate them to the process conditions. Current work in this

respect includes evaluation of methods used

to optimize properties of electrodeposited

coatings and corrosion resistance of rapidly

solidified nitrogenated steels.

Contact: John R. Manning

(301) 975-6157

email: manning@nist.gov

A153 Materials Building

POLYMER BLENDS AND

PROCESSING

The polymer blends and processing program

is designed to establish expertise in static and kinetic aspects of phase behavior in polymer blends, effects of shear flow on mixing and separating, and reactive processing

to promote compatibility. The focus on these areas furthers program objectives by acceler- ating development of new measurement

tools, including specialized light- and

neutron-scattering methods, and by applying those tools to expand the knowledge

base for thermodynamics and kinetics of polymer blends. Work extends to the effects

of additives in a blend system, the relative behavior of blends in bulk compared to in thin films at interfaces, and the effects of complex thermal and mechanical histories on the phase separation. Fundamental

advances in theory and modeling continue

to guide and interpret the measurements.

Current research in the program has four

areas of emphasis:

• measurement technology for on-line characterization of temperature, phase

behavior, and shear deformation;

• shear effects on phase diagrams and

phase morphology;

• activity of additives, compatibilizers, and

fillers; and

• control of interfacial effects in blends and

during processing.

In each of these areas the program works

with industry to develop measurement methods using tools of fluorescence, light scattering, neutron scattering and reflectivity, X-ray scattering, birefringence, microscopy

(AFM, TEM, phase contrast), and rheology.

Industrial collaborators include Aristech Chemical Corp., Dendritech, Inc., DSM

Research, Dow Chemical Co., Dow Corning

Corp., DuPont, Dynisco, Inc., Eastman

Kodak Co., Exxon Research and Engineering Co., General Electric Co., Goodyear Tire

& Rubber Co., Mobil Corp., Raychem Corp., Rohm and Haas Co., and 3M Co.

In order to promote communication and

technology transfer with an even broader range of industrial partners, the Polymer

Blends and Processing Center has been established. The focus of the center is efficient adoption of measurement technologies

developed at NIST and assessment of new

research directions for the polymer blends and processing program. The center also promotes initiatives that cut across research

projects to improve opportunities for industrial collaborators to use NIST measurement

capabilities.

Contact:

Eric Amis

(301) 975-6681

email: eric.amis@nist.gov B2 10 Polymer Building

POLYMER COMPOSITES

The polymer composites program seeks to

facilitate the introduction of lightweight,

corrosion-resistant composite materials into commercial applications by expanding the

essential science base and generating test methods, reference data, and standard materials. The outstanding properties of composites lead to products that are superior and

competitive in international markets. The

diverse transportation, construction, marine, offshore oil, medical devices, and

sporting goods industries have recognized

those benefits and are beginning to make

significant use of these materials. For this to continue, however, two significant barriers must be addressed: the lack of rapid, reliable, cost-effective fabrication methods and

the poor understanding of and predictive

capability for long-term performance. In response to these challenges, the composites program initiated two tasks: one on process- ing science and the other on interfacial microstructure. The degradation of the interface over time is primarily responsible for

the loss of mechanical properties. The auto- motive industry strongly influences the
MATERIALS SCIENCE AND ENGINEERING LABORATORY 135

composites program since many of the processing and durability issues span many

automotive applications, and solutions developed at NIST are expected to rapidly

propagate throughout the industry. Additionally, the group interacts with companies

interested in offshore oil platforms, infrastructure, aerospace, and a variety of other

applications.

The goal of the processing science task is to develop the technology required to monitor,

model, and control the events that occur during composite fabrication. The program

focuses on liquid composite molding since

this fabrication method is of great interest to

all industry sectors and is the consensus

choice of the automotive industry as the method with the most promise for making

structural automotive parts. The approach

in this task involves three steps:

• Measurement tools are developed and

used to characterize the material properties

that control processing, for example,

permeability.

• Sophisticated process simulation models

are formulated to analyze the effects of processing parameters rapidly and inexpensively

so they can be optimized.

• Process monitoring sensors are developed and used to provide feedback for verification and improvement of the simulation models

and to help develop the technology for online process control.

The current activities in this task involve

five projects, including a major industryuniversity-government program sponsored

by the Defense Advanced Research Projects Agency.

The work in the microstructure task focuses on developing test methods for assessing the

resin/fiber interfacial adhesion and the sub- sequent degradation of adhesion resulting from fluid attack, particularly moisture. The

long-term goals are to develop effective test methods, to use those tests to identify the chemical and physical mechanisms of degradation, and to formulate reliable predictive

models. The program focuses on glass fiber materials since they are the primary candidates for automotive applications. In addition, the researchers are beginning to look

at graphite reinforced composites since these systems are important for marine and infra- structure applications.

Microscale tests such as the single fiber frag- mentation test are being analyzed to deter- mine if they can provide realistic estimates

of the performance of the resin/fiber inter- face in composite systems. A variety of interfacial physical and chemical structures are generated during preparation of microscale

test specimens by varying the coating chemistry on the fiber, the resin processing speed, and the moisture content of the material.

Full-scale composite specimens also are pro- duced and tested with identical fiber coatings and processing conditions for comparison with the microscale tests and to

provide, in conjunction with the microscale

tests, realistic structure/performance relationships. There are currently four specific

projects in this task, including a collaboration with the Automotive Composites Consor- tium to determine the effects of processing

conditions on the interface of polyurethane

matrix composites.

Contact: Richard Parnas

(301) 975-5805

email: richard.parnas@nist.gov

B108 Polymer Building

ULTRASONIC

CHARACTERIZATION OF

MATERIALS

The program on ultrasonic characterization

of materials is directed to the development

of model-based methods of physical meas- urement that characterize the internal geometries of materials, such as defects, microstructures, and lattice distortions. The

goal of the program is to convert these measurement methods into sensors

suited for production line and in-service

measurements of materials quality and

serviceability.

A primary focus of the ultrasonic characterization program is microstructural characterization of metals and alloys, composite

materials, and engineered surfaces. The idea

is that models relate microstructure and

physical properties. Thus, by measuring

quantities related to physical properties, the salient microstructural features can be

ascertained. For example, sound velocity is

related to elastic properties, and thus, ultra- sonic measurements can be used to characterize fiber-orientation distributions in composites or texture in metals. These model-based measurements enable industry

to replace microscopy with non-destructive methods for the microstructural characterization needed to ensure the quality of advanced materials.

The ultrasonic characterization program is making significant contributions to meas- urement technology and materials modeling. NIST researchers have worked with

industry to commercialize advances in non-contact ultrasonics, wave-form-based

acoustic emission, composites nondestructive evaluation, and non-linear

ultrasonics. Modeling advances include exploring Green's function methods for wave propagation in anisotropic materials, obtaining elastic constants from resonance

spectra, and determining texture based on

ultrasonic measurements.

Contact: George A. Alers

(303) 497-7899

email: alers@boulder.nist.gov Mailcode 853.06

Boulder, Colo. 80303-3328
MATERIALS SCIENCE AND ENGINEERING LABORATORY

RESEARCH

FACILITIES

NIST CENTER FOR

NEUTRON RESEARCH

The NIST research reactor is the centerpiece

of the NIST Center for Neutron Research (NCNR) , a national center for the application of neutron methods to a variety of prob- lems of national concern. A major

component of the center is the cold neutron

source and guide hall, the first major facility in the United States devoted to cold neutron research. The cold source, which

employs a liquid hydrogen moderator near

the reactor core to produce intense neutron beams, offers modern cold neutron instru- mentation unique in this country. A wide

variety of internal and external research and measurement programs have benefited from

the broad range of capabilities at the NCNR

available to researchers from industry, universities, and government laboratories.

CAPABILITIES The NIST reactor is a D2O cooled and moderated reactor, with a peak thermal core flux

of 4 x 10

14 neutrons/cm2

-s. The core comprises 30 fuel elements of a unique, split- core design in which nine radial beam tubes look at a 17-centimeter gap between fuel- element halves. A large-volume cold source, guide hall, and eight guide tubes; two tangential and one vertical beam tube; a ther- mal column; several vertical thimbles; and four "rabbit" tubes complete the configuration.

The reactor operates continuously, 24 hours

a day on five-week cycles, followed by shut- downs of approximately a week for refueling and maintenance. The reactor utilizes the

available flux in a very efficient manner

through relatively short core-to-instrument

distances and large-diameter beam tubes. As a result, the flux on the sample for most

instruments is comparable to that at other major research reactors of higher power and

peak core flux. It is the only research reactor

in the United States in which a large volume

cavity for a cold source was included in the

structure from the beginning. Instrumental

capabilities are listed below according to the

properties investigated.

CRYSTALLOGRAPHYAW MICRO-STRUCTURE

• BT-1 high-resolution neutron powder dif- fractometer. This instrument is used to obtain neutron powder diffraction data for crystallographic analysis by the Rietveld method or for other characterization purposes. It is a 32-detector instrument that can

be used with three different monochromators and two different incident Soller colli- mators to tailor the instrument response to

the needs of the experiment. Diffraction peak widths are as low as 10 minutes (d/d = 8x10 ) with near Gaussian line shapes.

The instrument can be used with furnaces,

refrigerators, and cryostats so that data may

be collected at temperatures from 0.3 K to 1200 K, and magnetic fields to 7 T. For room-temperature data collection, a sixposition sample changer is available. Time

on the BT-1 diffractometer is available via

proposals.

• BT-8 diffractometer. Newly commissioned

at the BT-8 beam port at the NIST reactor is a state-of-the-art diffractometer for residual

stress, texture, and single-crystal studies, or DARTS. A basic monochromator drum has been modified to safely allow take-off-angles up to 120 degrees for high resolution diffraction measurement of residual stresses. Unique primary and secondary beamaperture systems, which allow a choice of

potential sampling volumes from 5x5x5

mm^ down to 1 x 1 x 1 mm , are incorporated. Each system translates toward or away

from the sample to facilitate the study of

large material structures or components

without requiring realignment of apertures

or repositioning of samples. The sample

table has 170-millimeter translational motion in the x, y, and z directions and can accommodate samples up to 50 kg. Among

the other features are a new 1 -millimeter

resolution position-sensitive detector system

and a four-crystal monochromator system

with remote selectability. This instrument is intended to be user friendly and available

for the solution of industrial or other outside problems.

• NG-3 30-meter small angle neutron scat- tering instrument. Sponsored by the National Science Foundation as part of the Center for High Resolution Neutron Scattering, this instrument is installed on a dedi- cated neutron guide, NG-3. Designed to cover a wide Q-range, from 0.015 nm"

1 to nearly 6 nm"

1

, it is suitable for examining

structural features in materials ranging from roughly 1 nm to 500 nm. At least 75 percent of the instrument time will be

allocated to guest researchers by the Pro- gram Advisory Committee through the NCNR proposal system.

• NG-7 30-meter small-angle neutron scattering instrument. The 30-meter small- angle neutron scattering (SANS) instrument on neutron guide NG-7 is virtually identical

to the NG-3 SANS. It is sponsored by NIST,

the Exxon Research and Engineering Co.,

the University of Minnesota, and Texaco

Research and Development. As an instru- ment developed by a participating research team (PRT), 75 percent of the beam time is used by the members of the PRT and the remaining 25 percent is available through

the NCNR proposal system.

Together, the 30-meter SANS instruments combine long flight paths and variable colli- mation to provide flexibility, angular resolution, and beam intensities that compare

favorably with any SANS instruments in the

world. Large-area position-sensitive detectors provide exceptional sensitivity to materials structures ranging from roughly

1 nm to 500 nm. Computer automated equipment is available for maintaining

samples at temperatures from 4 K to 700 K

and in magnetic fields up to 2 T (20 kG). To

extract structural information from the

data, the researchers analyze SANS patterns with an interactive color graphics system and related programs. Polarized neutron
MATERIALS SCIENCE AND ENGINEERING LABORATORY

capabilities are available on the NG-3

30-meter instrument.

• NG-1 8-meter small-angle neutron scat- tering instrument. The 8-meter SANS instru- ment is located at the end of neutron guide

NG-1 where the guide cross section is 50 mm x 50 mm. This is a moderate resolution instrument suitable for examining

structural features in materials from

roughly 1 nm to 100 nm. This SANS instru- ment is used primarily for the study of polymers.

• NG-7 NIST/IBiM/University of Minnesota

neutron reflectometer. Neutron reflec- tometry probes the neutron scattering density at depths up to several thousand

angstroms, with an effective depth resolution of a few angstroms. What is measured is the profile of reflectivity as a function of angle beyond the critical angle for total external reflection for samples that present a smooth, flat surface, preferably several square centimeters in area. The method is extensively used for studies of polymer and

biological surfaces, Langmuir-Blodgett

films, and thin films and multilayers of metals and semiconductors, both magnetic and

non-magnetic. This cold neutron reflectometer permits routine measurement of reflectivities as low as 10"7 in typical run times of a few hours. Independent movement of both sample and detector allows measurement of off-specular scattering. A position-sensitive detector permits simultaneous measurement

of specular and off-specular scattering.

• NG-1 cold neutron reflectometer with

polarized beam option. This reflectometer is used in investigations of magnetic multilayers, artificial biological membranes, semi- conductor surfaces, and other materials and

phenomena in surface and interfacial sci- ence. In contrast to the reflectometer on

guide NG-7, the sample surface geometry is

vertical rather than horizontal. Reflectivities below 10"8 can be measured. It has full polarized beam capability, provided by trans- mission supermirror polarizers. Not only can the incident beam be polarized, but also polarization analysis of the reflected beam

can be performed in a routine fashion. Polarization efficiencies as high as 98 per- cent are possible. A special feature of this instrument is the molecular beam epitaxy

chamber, which is available for in-situ neutron scattering studies.

MATERIALS DYNAMICS—Medium Resolution,

Incident Neutrons: E>10 meV

• BT-2 triple-axis/polarized-beam spectrometer. This instrument is used extensively for magnetic scattering studies. It can

be operated either as a standard triple-axis spectrometer or as a polarized-beam spec- trometer, depending on the monochromator

crystal choice, and has an incident neutron

energy range from 5 meV to 40 meV. The

latter can be a pyrolytic graphite (002) monochromator for standard 3-axis operation or a Heusler alloy monochromator for polarized beam experiments. Remotely

positionable filters, either 15.2 cm

(6 inches) of cooled (77 K) polycrystalline

Be, or 5.1 cm (2 inches) of pyrolytic graphite, may be inserted in the beam from the reactor before the monochromator crystal. The collimator housings before and after the sample position have been designed to provide guide fields for polarized beam

operation, and the Soller collimators and

blades are made from non-magnetic materials for the same reason. Spin-rotator devices can be mounted before and after the sample

position to flip the neutron spins. There is

also a guide field that can be selected by

computer control to be either vertical to the

scattering plane or in it. An extensive variety

of ancillary equipment to control the sample

environment is available.

• BT-4 triple-axis/filter- analyzer spectro- meter. This inelastic scattering instrument

offers choices for analyzer and monochromator that make it the most versatile of

the thermal-neutron scattering instruments

at NIST. One may use either the standard

triple-axis analyzer or cooled (77 K) filter analyzers of two types. The first, a block of

polycrystalline Be metal, yields an effective analyzer energy resolution of 3-5 meV. The

second filter analyzer option employs a

combination of polycrystalline Be, followed by a block of polycrystalline graphite. The

latter determines the effective analyzer energy resolution, which in this case is 1.2 meV. The monochromator choices are Cu

(220) for higher resolution studies or for measurements with higher incident neutron

energies, and pyrolytic graphite (002) fol- lower incident energies, with moderate reso- lution and higher beam intensities. The inci- dent neutron energy range is from 3-5 meV

to 250 meV. Monochromator changes can be made within a few minutes from the instru- ment console. Both monochromators are

vertically focusing with a radius of curvature, which changes to optimize intensity during the course of data acquisition.

• BT-9 triple-axis spectrometer. This instru- ment is a conventional triple-axis spectrometer, usually employing a vertically focusing

pyrolytic graphite monochromator. Recently

(mid-1994 to mid-1995), improvements

have been made to the monochromator

drum and the analyzer assembly. A new

monochromator assembly is in construction, which will permit remote selection

of a focusing Cu (220) monochromator,

Si (311) or PG (002), providing an incident energy range from 10 meV to 100 meV.

MATERIALS DYNAMICS—High Resolution,

Incident Neutrons E=1-15 meV

• Spin-polarized triple-axis spectrometer. This instrument is part of the Center for High Resolution Neutron Scattering supported by the National Science Foundation, from which the Center derives half of its funding. Two-thirds of its beam time will be

reserved for guest researcher experiments

through the NCNR proposal system. Located on guide NG-5, it is currently operated in three different modes: a conventional triple- axis mode, a horizontally focusing mode, and a polarized beam mode. A vertically focusing pyrolytic graphite (PG) monochromator produces beams with wavelengths from 2.2 A to 6.1 A (17 meV down to 2 meV)

Energy resolution is in the range of 0.03 meV to 1 meV, depending on incident wavelength and collimation. In the horizontally
138 MATERIALS SCIENCE AND ENGINEERING LABORATORY

focusing mode, a multicrystal analyzer with

1 1 independently rotating 2 cm x 15 cm

(width x height) PG blades can be used to focus scattered neutrons of a particular energy onto a single detector (diameter of 2.54 cm and length of 15 cm) and yield a signal increase of a factor of approximately

four by relaxing Q (wave vector) resolution. In the polarized beam mode of operation,

supermirror transmission polarizers, consist- ing of a stack of single-crystal Si plates with

Fe/Si supermirror coatings, are inserted in the incident and scattered beams.

• NG-6 Fermi-chopper time-of-flight spec- trometer. This spectrometer has a 150 mm

by 60 mm (height x width) beam cross section. The pulsed monoenergetic neutron beam is produced by a combination of monochromator crystals and a Fermi chopper. The double monochromator consists of two PG crystals, one of which can be curved

vertically to focus neutrons onto the sample

position. The curvature can be varied auto- matically to adjust for changes in monochomator-sample distances as the incident energy is varied. Two Fermi choppers with

different blade curvatures are available. An

oscillating radial collimator between the sample and detectors eliminates scattering from cryostat and furnace shields around

the sample position. The energy resolution

of this instrument, the first of two time-offlight spectrometers to be operating in the NCNR, lies in the range from 60 (J.eV to 1000 |J.eV. With incident neutron energies

from 2.2 meV to 15 meV, the spectrometer

allows a broad range of quasielastic scatter- ing experiments on diffusional motions in

solids and liquids, and inelastic scattering

experiments on magnetic and vibrational

excitations.

• Disk chopper time-of-flight spectrometer (DCS). The DCS at neutron guide NG-4 can

be used for a variety of experiments, such as investigating quasielastic scattering and low

energy inelastic scattering spectra in materials that exhibit diffusional and vibrational phenomena. It uses a set of chopper disks and a partitioned guide to produce pulses of

neutrons of a single wavelength at the sample position. There are three slots in each of the disks belonging to the first and last pair

of counter-rotating chopper pairs. By appropriately phasing these disks, the resolution

of the instrument can be changed without having to change the incident wavelength or

the speed of the choppers. Some of the note- worthy features include the flexible choice

of neutron wavelength and resolution; 840

detectors covering 5 percent of 4 pi steradians; a 0.2 nm to 1.2 nm (2 A to 12 A) inci- dent wavelength range (0.5 meV to 20 meV);

elastic energy resolution of 3 (leV to

1.2 meV. Two thirds of total beam time is available to guest researchers via proposals.

• High-flux backscattering spectrometer (HFBS). The HFBS occupies the end position on guide NG-2. This instrument enables scientists to perform ultra-high-energy resolution studies of the low-frequency dynamics

of a large variety of systems. Applications of backscattering spectroscopy are numerous

and include studies of rotational tunneling, molecular reorientation, diffusion, dynamics of liquids, and critical scattering near phase transitions. The goal of the HFBS is to provide an energy resolution of less than

1 (j.eV FWHM, while maximizing the neutron flux as much as possible using state-ofthe-art neutron optics. To this end, the instrument incorporates several flux- enhancing elements including a 4-meter- long converging guide, a large spherically

focusing monochromator and analyzer, and

a novel device known as a phase-space trans- form chopper. Representative performance

characteristics include energy resolution of

0.75 |aeV FWHM; a dynamic range of -60 ^ieV to +60 |ieV; Q-resolution of 0.1 A"

1

to 0.2 A"

1 FWHM; and an elastic Q-range of

0.1 A

_1 < Q <1.8 A" 1

.

• Spin echo spectrometer (SES). Sensitive

to the time-dependent density-density correlation function, the SES directly measures

the intermediate scattering function G(Q,t).

It bridges the gap in time scale between conventional inelastic neutron scattering and

dynamic light scattering. The NIST SES is

optimized for measurements of soft con- densed matter systems and will provide a Q-range of 0.01 A

_1 to 1 A

_1 and Fourier times of up to 10" 7

s. It will be used for studies of systems such as polymers, including

glassy polymers; biological model systems; and proteins.

CHEMICAL ANALYSIS

• Elemental analysis. Neutron activation analysis is performed utilizing the clean room for sample preparation, the reactor

irradiation facilities, semi-hot and warm

radiochemistry labs, and state-of-the-art radiation-counting labs. Development of methodology has aimed at accuracies and

sensitivities over concentrations of 10" 10 per- cent to 100 percent. Radiochemical separations for specific elements and multielement

analysis at the ultratrace level are available. A thermal neutron-capture prompt-gamma

activation analysis facility is operational, with a neutron fluence of 5 x 10 n/cm /s in a 2-centimeter-diameter beam.

• Cold neutron depth profiling instrument. With a measured chemical sensitivity 20 times that of the existing NIST thermal- beam instrument, this station at NG-0 features automated sample handling, near

real-time spectral processing, goniometer

positioning of sample and detectors, and

sample temperature control. Concentrations down to a few parts in 10 can be deter- mined, depending on the element and the matrix. Profiling to depths of a few tens of micrometers is obtained, with resolution in depth varying between a few nanometers and a few tenths of a micrometer.

• Cold neutron prompt-gamma-ray activation analysis. Related factors provide much

greater sensitivity for this method than any

existing thermal-beam instrument in the world. First, the high quality of the neutron beam and the low background at NG-7

allow closer sample-detector spacing, result- ing in higher counting efficiency and better

sensitivity, especially in the energy region below 1 MeV. Second, the high count rates

possible with this high efficiency (greater than 50 thousand counts per second) can be
MATERIALS SCIENCE AND ENGINEERING LABORATORY

measured without loss of quality with recent advances in instrumentation. This equip- ment provides unique measurements of chemical elements, such as hydrogen (detection limit <2 jig) .which are difficult to

detect by other means.

DOSIMETRYAND FUNDAMENTAL NEUTRON

PHYSICS

• Neutron standards and dosimetry. A number of neutron fields for standards and

dosimetry are available. These include a Cf

fission source, a % cavity fission source,

the thermal column beam, an intermediate energy standard neutron field, and 2-, 24.5-, and 144-keV filtered beams.

• Fundamental physics station. This facility

is available for use in collaboration with the NIST fundamental physics research group. Occupying an end guide position in the guide hall, the physics station was recently instrumented for a new measurement of the

lifetime of the neutron.

• Neutron Interferometry and Optics Facility. This facility, located in the guide hall of the NCNR, is the world's premier user facility for neutron interferometry and related neutron optical measurements. A neutron

interferometer (NI) splits, then recombines, neutron waves. This gives the NI its unique

ability to experimentally access the phase of neutron waves. Phase measurements are used to study the magnetic, nuclear, and

structural properties of materials, as well as fundamental questions in quantum physics. Related, innovative neutron optical tech- niques for use in condensed matter and

materials science research are being

developed.

OTHER CAPABILITIES

• Instrument development station. A cold neutron beam position deliberately has been

left uninstrumented, except for the provision

of an optical bench and positioning devices,

in order to allow for development of new

neutron beam methods and devices, especially in the areas of neutron optics and neutron-based chemical analysis methods. The

station is located at a beam port, NG-0,

which looks at the cold source, but termi- nates in the reactor confinement building

rather than in the guide hall. A particularly

interesting and successful project that has been carried out at this station in recent

years has to do with neutron focusing using

capillary optics to produce a neutron lens.

• Irradiation facilities. Four pneumatic

tubes with fluence ranges of 3 x 10

11 n/cm2/s to 2 x 10

14 n/cm2/s for irradiations

of seconds up to hours are available. These

use polyethylene irradiation containers with volumes up to 40 ml. The cadmium ratio range for these facilities is 4 to 3000 (Au). For long irradiations 6-centimeter- and

9-centimeter-diameter in-core thimbles are

used. These are D2O filled with fluences of 2-4 x 10

14 n/cm2/s.

• Neutron radiography. Radiography facilities are available at a highly thermalized beam of the thermal column. Fluences range from 10 n/cm /s to 10 n/cm7s, depending on resolution, with a Cd ratio of 500:1 and an L/D ratio adjustable from 20:1

to 500:1. The beam is 25 cm in diameter at the image plane 2 m from the reactor face.

Facilities for autoradiography of paintings,

including labs and a darkroom, are available. This facility currently is being modified to allow new studies using tomographic

methods.

APPLICATIONS The unusual sensitivity and range of measurements possible at the NCNR provide applications in materials structures, materials dynamics, chemical analysis, and neutron

physics. Currently operational instruments

are used to study crystal structures, microstructures, and molecular dynamics in the bulk and surfaces of metals, ceramics, poly- mers, composites, and biological materials. Systems under study include colloidal mixtures, catalysts, thin films, layered structures, and interfaces; magnetic systems including amorphous magnets and spin

glasses, superconductors, and magnetic

multilayers; hydrogen in metals; shear- induced phenomena; molecular geometry of polymer and biological macromolecules;

chemical composition of semiconductors; and other advanced materials. Other major

programs include studies in environmental

chemistry, nutrition, biomedicine, energy, and electronic devices, with emphasis on

Standard Reference Materials for these appli cations as well as neutron fluence standards

for power reactor pressure vessel irradiation

surveillance, ultralight mass assay for commercial track recorder detectors, absolute

fission-rate measurements, and develop- ment of thermal neutron beam monitors.

AVAILABILITY The NCNR operates as a national facility open to all qualified researchers. Twentyfive thermal- and 15 cold-neutron experi- mental stations have been developed for use by the general U.S. research community,

operating more than 250 days per year. On

most of the cold neutron instruments twothirds of the available time is allocated by a program advisory committee on the basis of

scientific merit of written proposals. Partici- pating research teams—which constitute another mode of utilization—are responsible for design, construction, and mainte- nance of the facilities in return for three-fourths of the available time.

Annually about 1,200 researchers from

government organizations, U.S. industrial and university laboratories, and foreign

laboratories participated in research at the

facilities, either collaboratively with NIST

staff or on a proprietary basis.

Contact:

J. Michael Rowe

(301) 975-6210

email: mike.rowe@nist.gov A106 NIST Center for Neutron Research
140 MATERIALS SCIENCE AND ENGINEERING LABORATORY

MATERIALS SCIENCE

X-RAY BEAMLINES

NIST operates two beam stations on the X23A port at the National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory in New York. The light source

provides an intense continuous-spectrum

beam of collimated and polarized X-rays many orders of magnitude brighter than the beams provided by conventional laboratory

sources. These two beam stations offer access to dedicated instrumentation for small-angle X-ray scattering, X-ray diffrac- tion imaging (topography), and extended

X-ray absorption fine structure.

CAPABILITIES Small-angle X-ray scattering can be carried out in the photon energy range from 5 keV

to 1 1 keV. The minimum wave vector is 2 1 4 x 10"' nm" and the wavelength resolution is AAA=10~4

, enabling anomalous

small-angle scattering with excellent resolution. Diffraction imaging of single crystals and powders is carried out with monochromatic photons between 5 keV and 30 keV. An

energy-tunable X-ray image magnifier

enables imaging of microstructure down to

less than 1 mm. The energy-scanning

experiments, primarily X-ray absorption fine structure (XAFS), also are performed over an

energy range from 5 keV to 30 keV.

APPLICATIONS Small-angle scattering measurements on

ceramic and metallurgical materials are used to characterize the microstructure in the 2-nanometer to 1-micrometer size range

as a function of starting chemistry and processing parameters. Scattering from a particular entity can be separated from other

scatterers in a complex material using

anomalous small-angle X-ray scattering. Diffraction imaging is used to study imperfections and strains in single crystals and

powder compacts. The structure of strained semiconductor interfaces and metal multilayers can be studied using XAFS. A combination of XAFS and diffraction will provide a

capability for site-specific local structure determination in crystals.

AVAILABILITY Beam time is available to qualified scientists provided safety requirements are met and

scheduling arrangements can be made. Proposals for collaborative use of the facility are reviewed at NIST; proposals for independent

use of the facility should be submitted to the NSLS.

Contact:

Gabrielle G. Long

(301) 975-5975

e-mail: gabrielle.long@nist.gov A163 Materials Building

CENTER FOR

THEORETICAL AND

COMPUTATIONAL

MATERIALS SCIENCE

The NIST Center for Theoretical and Computational Materials Science (CTCMS) is a research program addressing industry's needs for theory and modeling tools for materials design and processing. Founded in

1995, the CTCMS is a center of expertise in computational materials research that devel- ops tools and techniques and fosters collaborations. CTCMS goals are to investigate

important industrial problems in materials theory and modeling with novel computational approaches, create innovative and

productive opportunities for collaboration in materials theory and modeling, develop

powerful new tools for materials theory and

modeling, and accelerate their integration

into industrial research.

CAPABILITIES To use more effectively the nation's

resources, the CTCMS integrates ongoing

research at various institutions by forming

temporary multidisciplinary and multiinstitutional research teams as required to attack key materials issues. The CTCMS has

three principal activities, all operating interactively: planning, research, and technology

transfer. Workshops are held as the first step in defining technical research areas with sig- nificant technological impact, identifying team members, and building the infrastruc- ture for collaborative research. The CTCMS

provides an infrastructure and support for

its members, including an interactive World Wide Web information server (www.ctcms.nist.gov) and modern computing and workshop facilities.

APPLICATIONS

Current research areas include theory and

simulation of phase transformation kinetics and morphology, micromagnetics, composite materials, foams, microstructure and

dynamics of disordered and partially ordered

materials, complex fluids, materials reliability, reactive wetting, pattern formation in polymers and alloys, granular materials,

crystal growth, sintering, and solidification. Simulation techniques include finite ele- ment, finite difference, Lattice Boltzmann,

molecular dynamics, Monte Carlo, and cellular automata methods. Current CTCMS working groups include the following:

• Micromagnetic materials. This working

group is addressing the need for accurate, standardized micromagnetics modeling

tools. Software tools developed by the group and selected sample geometries may be found at www.ctcms.nist.gov.

• Solder interconnect design. The solder interconnect design team is developing

public-domain software tools to improve

electronic packaging processes. Tools devel- oped by the solder group that model stand- ard solder interconnect geometries are

available at www.ctcms.nist.gov.

• Microstructure and dynamics of frustrated materials. This working group is applying new computational capabilities to characterize the relationship between microstructure and dynamics in glasses, plastics, and other amorphous materials and developing a new set of measurement standards.
MATERIALS SCIENCE AND ENGINEERING LABORATORY

• Pattern formation in filled polymers. This new working group is developing computational tools to characterize and improve the

properties and functionality of filled poly- mer materials.

• Deformation of metals. This new working

group is developing a theory that bridges the length scales between single atomistic dislo- cations and macroscopic deformation of a

piece of metal, such as an aluminum bar or an automobile part.

• Green's function library. This team of researchers is developing an interactive,

electronic library tool of Green's function and boundary element solutions to reduce

the time and cost of industrial component

design.

• Object-oriented finite element modeling

of composite materials. This team of researchers is developing a set of object- oriented finite element modeling tools to improve the characterization and property

prediction of composite materials. Public domain software tools are available at www.ctcms.nist.gov.

Also available on the CTCMS webserver are public domain software tools for modeling

3-D crystal shapes. The program, known as Wulffman, was developed at the CTCMS and

is designed to run with Geomview software developed at the Minnesota Geometry Center. It currently is being used in industry to design materials used in reflective paints.

AVAILABILITY The CTCMS facilitates numerous interactions between industry, academia, NIST, and

other government and national labs to apply

materials theory and modeling to solve U.S.

industrial problems in materials design and

processing. Researchers interested in joining

existing efforts or starting new ones are encouraged to contact the CTCMS. The

center welcomes proposals for focused workshops in materials theory and modeling at any time. Proposals will be funded on the

basis of scientific merit and availability of funds. Computing and workshop facilities are available to U.S. industry, other govern- ment agencies, and academia for collaborative research projects. The CTCMS

participates in the National Research Council postdoctoral fellowship program and

hosts short-term and long-term visitors.

Contact: Sharon Glotzer (301) 975-5729

email: sharon.glotzer@nist.gov A309 Materials Building

MAGNETIC ENGINEERING

RESEARCH FACILITY

CAPABILITIES This is an elaborate new facility specifically designed for advancing key enabling tech- nologies in the field of ultrahigh-density data storage. Films can be deposited both by

the methods preferred in basic research (molecular beam epitaxy) and by the methods of industrial manufacturing (magnetron sputtering). Numerous in situ characterization techniques are available including scanning tunneling microscopy, X-ray photoelectron spectroscopy, Auger electron spectroscopy, ion scattering spectroscopy, low-energy electron diffraction,

reflection high-energy electron diffraction, and mass spectrometry. For in situ magnetic

measurements, both a superconducting

magnet and an electromagnet are available and are equipped for magnetoresistance and

magneto-optical Kerr effect measurements.

As such, this facility constitutes the most

elaborately instrumented magnetic thinfilm deposition facility in the world.

The capabilities of this in situ instrumentation allow samples to be investigated at

every step of fabrication with the most modern surface, interface, and magnetic diagnostics. Properties that can be investigated

include elemental composition, thickness, atomic structure, roughness, and magnetic

and magnetoresistive properties. These

capabilities allow researchers to establish

the correlations between the film structure and properties and to use the resulting

insights to control and improve the properties of device-related materials.

APPLICATIONS

This facility presently is being used to pre- pare magnetic spin valves possessing

giant magnetoresistance (GMR) effects and

to study the physics related to their fabrication. These devices, which are partially comprised of 1- to 2-nanometer-thick

alternating layers of Co and Cu, will be used

in the next generation computer hard disk read-heads and possibly in a new generation

of non-volatile memory chips to compete

with dynamic random access memory. For

the past three years in this highly competitive area, Magnetic Engineering Research

Facility (MERF) activities have led the world

in devices possessing the largest GMR values with the switching fields small enough for

devices. Through close association with the National Storage Industry Consortium,

which comprises the leading magnetic

recording companies, NIST has provided the MERF results to the recording industry on a continuous basis. In 1997 two Japanese companies began commercial production of GMR read-heads for hard disks, and U.S. manufacturers are just about to do the same. Fierce competition is under way to dominate this key technology of the information storage industry. This introduction of GMR heads means that only eight years elapsed between the discovery of the GMR

effect and its introduction into commercial

products. The MERF facility is being used to support U.S. industry in the competition by

making measurements that industry is not equipped to make. This approach is expected

to lead to the development of GMR read- heads in the future that are even better than

the ones of today and help keep U.S. industry competitive in world markets.
42 MATERIALS SCIENCE AND ENGINEERING LABORATORY

AVAILABILITY The MERF is open to all qualified U.S. researchers who are interested in collaborative research. Scientists from industry particularly are encouraged to take advantage

of the opportunities for collaborative research of interest to their companies.

Several such collaborations presently are under way. However, facility time can be made available for new collaborations if the proposed research is designed to promote the agenda of our customers.

Contacts: William F. Egelhoff , Jr. (301) 975-2542

email: william.egelhoff@nist.gov

B248 Chemistry Building

Robert D. Shull

(301) 975-6035

email: robert.shull@nist.gov B152 Materials Building

SMALL-ANGLE X-RAY

SCATTERING FACILITY

Small-angle X-ray scattering (SAXS) is a technique in which a highly collimated beam of X-rays (wavelength range 0.07 nm

to 0.3 nm) is used to probe the structure

of materials on the size scale of 0.1 nm to 100 nm.

Materials exhibiting structure in this size range include polymers, biological macromolecules, ceramics, metals, and alloys. The

small-angle scattering patterns can be analyzed to characterize the size and shape of

the scattering centers as well as their spatial

distribution and surface area. Data obtained from these experiments are complementary

to data obtained from other diffraction studies and from morphological studies using

electron microscopy.

CAPABILITIES The NIST 10-meter SAXS camera uses a 12-kilowatt rotating anode X-ray generator

as a source of X-rays. The target is usually copper lambda(K alpha) = 1.54, but additional wavelengths are available. The colli- mation path is defined so as to permit 10" J

nm" resolution in reciprocal space at the surface of a two-dimensional positionsensitive proportional detector. The collimation path and the scattered beam path are evacuated, and all elements of vacuum

operation, X-ray optical configuration,

sample selection, and calibration are computer controlled. Image data are collected by

a minicomputer, and a complete collection

of software is available for displaying, analyzing, and modeling the results.

Sample chambers are available for measure- ments at high temperatures and to deform

specimens during measurement.

APPLICATIONS The SAXS technique is used to study molecular conformation, microphase domain structures, crystallization phenomena, network

formation, craze initiation, void distribution, and similar phenomena resulting from

fluctuations in electron density within a

material. Such studies are currently of broad

interest in all areas of materials science.

AVAILABILITY This facility is operated by members of the NIST staff in support of their active research program in polymeric materials. It is available for use by researchers from industry,

academia, and other government agencies on either a collaborative or proprietary

basis.

Contact: John D. Barnes

(301) 975-6786

email: john.barnes@nist.gov A209 Polymer Building

POWDER

CHARACTERIZATION AND

PROCESSING

LABORATORY

Advanced ceramics are manufactured by the consolidation of fine powders. Researchers

at NIST are working to develop the scientific foundation needed for improving reproducibility and reducing the cost of producing

ceramic components. The powder characterization facility offers specialized instrumentation for measuring physical

properties, phase composition, and surface chemical properties. In addition, facilities

exist for processing and synthesizing

ultrapure powders.

CAPABILITIES • Physical properties measurement.

Particle-size distribution, specific surface

area, specific gravity, and porosity are some

of the major physical properties for which

instrumentation is available. Powder-size

distribution can be determined by gravity sedimentation followed by X-ray absorption,

centrifugal sedimentation, light diffraction, and photon correlation spectroscopy. The

size range of these instruments covers

0.03 M-m to 200 |im. Each instrument works

in a specific range and provides the data in

the form of a discrete size range. The particles are examined directly by the application

of scanning and transmission electron microscopy of particles as small as 0.001 jim.
MATERIALS SCIENCE AND ENGINEERING LABORATORY

• Surface and interface chemistry measurements. The surface and interface characterization of powders contributes to the knowledge base of the surface interactions

of particles in contact with dispersants and

binders. As the particles become smaller,

their surface characteristics become more

significant. MicroRaman and Fourier trans- form infrared spectroscopy are used to study

surface composition, and electrophoretic

mobility and acoustophoretic mobility are used to study modification to the powder surface as a result of an interaction with dispersants and binders.

• Phase composition. Since most of the ceramic powders undergo phase transformation during densification, understanding the phase changes in specific densification envi- ronments is an active part of NIST research. The Siemens high-temperature X-ray diffrac- tometer has a temperature range from room

temperature to 3000 K and a positionsensitive detector. In addition, sintering can

be carried out in oxygen-free argon or nitro- gen environments.

• Solid-state imaging. The solid-state nuclear magnetic resonance (NMR)

spectrometer/imager carries out measure- ments in chemical shift, nuclear spin density, relaxation times, and imaging of NMR

active nuclear distribution. Ceramic powder

slurries, green bodies, and dense ceramics can be analyzed for identification of impurities, chemical state, and composition distri- bution by non-destructive evaluation. In

addition, the NMR can determine amorphous phase content of the powders.

• Powder synthesis. The ability to synthesize powders of controlled characteristics is necessary for development of a powderprocessing knowledge base. The fine-powder

synthesis facility consists of a chemical flow

reactor for controlled synthesis and inert atmosphere chambers. A solution atomizer

is available to generate polydisperse aerosols

in the range of 0.001 |im to 1.0 \im, as is a

spray dryer to form monodisperse agglomerates in the range 0.5 Jim to 100 |im.

• Colloidal suspensions preparation.

Colloidal processing of ceramic powders

has emerged as an attractive technology for producing defect-free ceramics. However, some major issues still remain to be

addressed, including the lack of characterization techniques for slurries that contain high concentrations of solids and

scientific understanding of limitations in

the preparation of such slurries. The powder

processing laboratory consists of an acoustophoresis instrument, a rheometer, a high- energy agitation ball mill, and slurry consolidation equipment. These techniques

are used to study interface chemistry, flow

behavior, size reduction, morphology modification, and densification of polydisperse particles and similar processes resulting from

interactions between the particles and their environment.

AVAILABILITY These facilities are used primarily to support NIST research programs using ceramic powders. They are available for collaborative or independent work by qualified government,

industry, or university personnel with prefer- ence given to projects related to ceramics

research.

Contact: George Onoda

(301) 975-4489

email: george.onoda@nist.gov A256 Materials Building
PHYSICS LABORATORY

The NIST Physics Laboratory supports

U.S. industry by providing measurement

services and research for electronic, optical, and radiation technology. It pursues

directed research in the physical sciences; develops new physical standards, measure- ment methods, and data; conducts an

aggressive dissemination program; and

collaborates with industry to commercialize inventions and discoveries. The laboratory's programs range from tests of fundamental postulates of physics to the more immediate needs of industry and commerce.

Much of the laboratory's research is devoted to overcoming the barriers to the next technological revolution, in which

individual atoms and molecules will serve

as the fundamental building blocks of

electronic and optical devices. To develop

the necessary measurement capabilities

for these new products, laboratory scientists use highly specialized equipment to study and manipulate individual atoms and molecules.

The laboratory's work in support of industry covers a broad scope of activities. For example, the laboratory is working to improve optical measurement techniques used in remote sensing, advanced color graphics systems, and optically pumped

atomic clocks. Research also is focused toward advancements in the measurement

and dosimetry of ionizing radiation used

in medicine and industry and supports the development of emerging technologies such as X-ray lithography, digital X-ray

imaging, and electron beam processing.

Contact: Katharine B. Gebbie, Director (301) 975-4201

email: katharine.gebbie@nist.gov

fax: (301) 975-3038 B160 Physics Building

http://physics.nist.gov

COOPERATIVE RESEARCH

OPPORTUNITIES

Office of Electronic Commerce in Scientific and Engineering Data

145 Electronic Commerce in Scientific and

Engineering Data 145 Dissemination of Databases over Computer Networks

Fundamental Constants Data Center

145 Evaluation of Fundamental Constants, Measurement Uncertainties, and SI

Electron and Optical Physics

146 Photodiode Detectors for Radiometry

146 EUV Optics Characterization 146 Tunneling Microscopy 147 Magnetic Microstructure 147 Nanofabrication with Atom Optics 147 Condensed Matter Theory

1 47 Data for Electronic Structure Calculations 148 X-ray Nanotomography

148 X-ray and EUV Microscopy

Atomic Physics

148 Vacuum Ultraviolet Radiometry

148 Low-Temperature Plasmas

149 Research on Highly Ionized Atoms

149 Laser Cooling and Trapping

149 High-Precision Laser Spectroscopy

149 Fourier Transform Spectrometry

150 Interactions of Cold, Trapped Atoms

1 50 Theory for Nanoscale Systems and

Metrologies 150 Precision X-ray and Gamma-ray

Spectroscopy 150 Synthetic Multilayers

151 Applications of X-ray Technology

Optical Technology

151 Luminescence Spectral Radiometry

151 Photometry 152 High-Accuracy Cryogenic Radiometry

152 Thermal Radiometry

152 Near Ultraviolet Radiometry

152 Spectral Radiometry 153 Infrared Spectral Radiometry

153 Spectroscopic Applications

153 Non-Linear Optical Measurements

153 Optical Scattering Measurements

154 Near-Field Scanning Optical Microscopy 154 Time-Resolved Infrared Spectroscopy 154 Elementary Chemical Reaction Dynamics

Ionizing Radiation

155 Radiation Processing 155 Measurement Quality Assurance 155 Neutron Physics 156 Neutron Dosimetry

Time and Frequency

156 Ion Storage Research

1 56 Atomic Beam Frequency Standards

157 Noise in Electronic and Optical Systems

157 Statistical Analysis of Time-Series Data 157 Time Transfer and Network

Synchronization

157 Far-Infrared Spectroscopy

157 High-Performance Diode Lasers

Quantum Physics

158 Bose-Einstein Condensation

158 Thin Films

158 Laser Deposition of Thin Films

158 Mobility of Cluster Ions

159 Stabilized Lasers

RESEARCH FACILITIES

159 Synchrotron Ultraviolet Radiation

Facility III 159 Magnetic Microstructure Measurement

Facility

159 High-Resolution UV and Optical Spectroscopy Facility

160 Low-Background Infrared Radiation

Facility

160 Controlled Background Radiometric

Facility 160 Medical-Industrial Radiation Facility

161 Electron Paramagnetic Resonance Facility

162 Radiopharmaceutical Standardization Laboratory 162 Neutron Interferometer and Optics

Facility

SERVICES

163 Time and Frequency Services
PHYSICS LABORATORY 145

COOPERATIVE RESEARCH

OPPORTUNITIES

OFFICE OF ELECTRONIC

COMMERCE IN SCIENTIFIC

AND ENGINEERING DATA

Office Contact: Edward B. Saloman

(301) 975-5554

email: edward.saloman@nist.gov

fax: (301) 975-4578 Bl6l Technology Building

ELECTRONIC COMMERCE

IN SCIENTIFIC AND

ENGINEERING DATA

The Office of Electronic Commerce in Scientific and Engineering Data works to promote

compatibility and integration in the dissemi- nation of non-product-specific information

required by U.S. industry. It seeks to make

scientific, engineering, technical, codes/standards, and related regulatory information available to U.S. industry in a

usable, accessible, unified manner. The

office's goal is to help make it possible for industry to create an electronic marketplace

that will allow participants to efficiently

locate, access, protect, contribute, and pay

for scientific, engineering, and regulatory information. This information will be pro- vided in open formats and computersensible form along with specification of the

quality and security of the provided information. Work on this effort began with an

industry/government team organized in conjunction with the National Initiative for Product Data Exchange. The team identified and defined 19 specific functions needed to make such an information capability a reality. A World Wide Web page is being created

to identify the required functions and to provide information about progress in each

of them. In addition, plans are to make web

databases available to developers as testbeds

to demonstrate their methods of achieving

these functions. This web page will serve both to inform the data producing and

using communities about progress toward an effective dissemination system as well as

to encourage the computer technology community to build the capabilities necessary

for technical data into its systems. In addition, the databases disseminated by the Physics Laboratory on its web page will serve

as models of effective dissemination of scientific and engineering data.

Contact: Edward B. Saloman

(301) 975-5554

email: edward.saloman@nist.gov Bl6l Technology Building

DISSEMINATION OF

DATABASES OVER

COMPUTER NETWORKS

The Office of Electronic Commerce in Scientific and Engineering Data is responsible for the Physics Laboratory's World Wide Web

page. It produces Physics Laboratory material for publication on the web, encourages and supports the production of material by

others, and assures the high quality of infor- mation disseminated by the Physics Laboratory over the electronic networks. In

addition, the office develops methods to dis- play information generated within the laboratory in an effective manner on the web. This office also works with the Physics Laboratory divisions and Standard Reference Data staff in developing physical reference databases for dissemination on the web. It designs effective interfaces between the infor- mation and the user to facilitate use of the

data. Several databases are available already

and may be accessed from the Physics Lab web page under Physical Reference Data

(http://physics.nist.gov/PhysRefData/ contents.html), and a number of other data- bases are being developed for use on the web.

Contact: Edward B. Saloman

(301) 975-5554

email: edward.saloman@nist.gov Bl6l Technology Building

FUNDAMENTAL

CONSTANTS DATA

CENTER

Center Contact: Barry N. Taylor

(301) 975-4220

email: barry.taylor@nist.gov

fax: (301) 975-4578 Bl6l Technology Building

EVALUATION OF

FUNDAMENTAL

CONSTANTS,

MEASUREMENT

UNCERTAINTIES, AND SI

The fundamental physical constants, such

as the Rydberg, Planck, fine-structure, and

Avogadro constants, are the links in the chain that bind all of science and technol- ogy together. Further, they can serve as the

basis for improved practical representations

of the International System of Units (SI) and thus for more accurate measurements

of importance to both science and

technology.

The primary goal of the Fundamental Constants Data Center (FCDC) is to issue peri- odically a set of recommended values of the fundamental physical constants and basic conversion factors of physics and chemistry. This is accomplished by critically reviewing

all data relevant to the constants that is available at a given epoch and analyzing it by a variety of methods, including least- squares. The resulting set of recommended
PHYSICS LABORATORY

values is distributed widely via archival journals, handbooks and reference books, text- books, professional society magazines, and a web site.

Because of the FCDC's expertise in analyzing fundamental constants data, it is deeply

involved in the worldwide effort to standardize the method of expressing uncertainty

in measurement. To this end, it revises and

publishes from time to time NIST Technical

Note 1297, Guidelinesfor Evaluating and

Expressing the Uncertainty ofNIST Meas- urement Results.

Another principal task of the FCDC is to

serve as the NIST-authorized organization

for the interpretation of SI in the United

States. As part of this task, the FCDC revises and publishes periodically NIST Special Publication 811, Guidefor the Use of the Inter- national System of Units (SI).

Center Contact:

Barry N. Taylor

(301) 975-4220

email: barry.taylor@nist.gov Bl6l Technology Building

ELECTRON AND OPTICAL

PHYSICS

Division Contact:

Charles W. Clark

(301) 975-3709

email: charles.clark@nist.gov

fax: (301) 208-6937 B102 Radiation Physics Building

http://physics.nist.gov/Divisions/Div84l/ div84l.html

PH0T0DI0DE DETECTORS

FOR RADIOMETRY

Highly stable photodiode detectors with uni- form spatial sensitivity are developed, calibrated, and distributed as transfer standard

detectors for radiometry in the wavelength

region of 5 nanometers to 254 nanometers.

Detectors presently available at NIST include

AI2O3 photocathode windowless photodiodes

for the region 5 nanometers to 122 nanometers; CsTe photocathode windowed

(evacuated) photodiodes for the region 1 1

nanometers to 254 nanometers; and silicon photodiodes, developed in collaboration with industry, for the region 5 nanometers

to 254 nanometers. Some other types of

detectors can be calibrated by special

arrangement. Broadband photometers also have been developed in collaboration with

outside users and calibrated in this spectral region, e.g., combinations of silicon photodiodes with thin-film filters for plasma diagnostics and vacuum ultraviolet solar radiometry.

Contact:

L. Randall Canfield

(301) 975-3728

email: l.canfield@nist.gov Bl 19 Radiation Physics Building

EUV OPTICS

CHARACTERIZATION

The emerging field of high-reflectance, normal-incidence soft X-ray or extreme

ultraviolet (EUV) optics has a wide range of

applications. The ability to produce highquality images at wavelengths below 40 nanometers has allowed construction of EUV

solar telescopes with unprecedented resolution, EUV microscopes able to study living

biological samples with submicrometer resolution, and EUV photolithographic systems

that are proposed as tools for the next generation of integrated circuits.

NIST has an EUV multilayer characterization facility at the Synchrotron Ultraviolet Radiation Facility storage ring. The

current facility, which has been disassembled for upgrading, was designed to measure

the reflectance or transmittance of EUV

optics such as mirrors, filters, and gratings

as a function of wavelength, angle of inci- dence, and position on the optic. NIST is constructing a new facility that will extend measurement capabilities to larger and more curved optics and shorter wavelength.

A thin-film deposition chamber has been added to the reflectometry facility that allows measurements of films as they are being deposited. From these measurements

the optical constants of important multilayer materials can be determined free from

influence of surface contaminants.

Coritact: Charles Tarrio (301) 975-3737

email: charles.tarrio@nist.gov B102 Radiation Physics Building

TUNNELING

MICROSCOPY

Scanning tunneling microscopy (STM) is a

highly sensitive probe of surfaces, which utilizes the quantum mechanical principle of tunneling to probe surface topography on a nanometer scale. The STM also is inherently

sensitive to surface electronic properties that can be exploited to detect the surface elec- tron density of states and, in certain cases,

for selective imaging of different elemental

species. An ultrahigh vacuum STM with

extensive facilities for tip and sample preparation and characterization has been used

by NIST scientists to investigate four main

areas relating to nanometer-scale science:

epitaxial growth, correlation of microstructure and magnetism, electron spindependent contrast measurements in STM,

and electronic properties of nanostructures. Experimental efforts employ customdesigned instrumentation with which NIST

scientists strive to push the frontiers of visualization of the nanometer-scale world.

Currently, a tunneling microscope is being

designed to operate in ultrahigh vacuum

at liquid helium temperatures with the

possibility of applying a magnetic field up to

10 tesla to the sample.

Contact- Joseph Stroscio

(301) 975-3716

email: joseph.stroscio@nist.gov B206 Metrology Building
PHYSICS LABORATORY

MAGNETIC

MICROSTRUCTURE

Low dimensional magnetic systems (such as thin films, multilayers, and surfaces) as well

as reduced dimensional systems (such as granular materials and microscopic litho- graphic devices) exhibit many scientifically

interesting and technologically useful

properties. NIST scientists use three complementary magnetic imaging techniques

scanning electron microscopy with polarization analysis (SEMPA), magneto-optic Kerr microscopy, and magnetic force micros- copy—to determine the role physical and

magnetic microstructure plays in determining macroscopic magnetic properties. SEMPA, which images the magnetization by

measuring the spin polarization of secon- dary electrons emitted in a scanning

electron microscope, features high

(20-nanometer) resolution, long working

distance, large depth of field, and a direct measurement of the vector components of magnetization independent of topography.

SEMPA is a relatively surface sensitive tech- nique, making it especially well suited for in

situ studies of thin-film and surface magnetism as recently demonstrated by investigations of the oscillator}' exchange coupling of magnetic layers.

Contact: John Unguris

(301) 975-3712

email: john.unguris@nist.gov

B206 Metrology Building

NANOFABRICATION WITH

ATOM OPTICS

NIST scientists are studying the physics of

laser focusing of atom beams to find ways to develop a fabrication tool that could lead to more compact microcircuits, higher density

magnetic recording media, better sensors, and novel materials. Laser beams form

lenses that focus neutral atoms into tiny

regions as they deposit, building

nanostructures on a surface. The chromium

atoms used in this process emerge from an

effusive, high-temperature oven, are colli- mated by laser cooling, and pass through a

laser standing wave, which acts as an array

of "lenses," focusing the atoms into an

array of lines. The nanofabrication of a two- dimensional array of chromium dots also can be achieved by using two orthogonal

standing waves. The very regular arrays of chromium lines and dots with spacing tied

to optical wavelength promise to provide useful standards. Atom optical methods potentially can be extended to a much broader range of materials. Metastable rare gas atoms can be manipulated with lasers and

contain internal energy that has been used

to expose a resist. A pattern of light can be

used to de-excite the metastables; in this way light can be used as a mask for matter,

instead of matter being used as a mask for

light as in optical lithography.

Contact: Jabez McClelland

(301) 975-3721

email: jabez.mcclelland@nist.gov B206 Metrology Building

CONDENSED MATTER

THEORY

Many theoretical techniques are used to study a wide range of problems related to

the interactions of electrons in solids, includ- ing electronic structure calculations, transport in magnetic multilayers (giant

magnetoresistance), exchange coupling in magnetic multilayers, surface growth, spindependent reflection from interfaces, magnetic hysteresis in ultrathin films, light emission produced by scanning tunneling

microscopy of a magnetic surface, electron energy loss in magnetic and non-magnetic

solids, high-temperature superconductivity,

and various microscopic tunneling phenomena. The theory effort helps interpret and

guide experiments and provides the

theoretical understanding crucial to the

development and application of new meas- urement techniques.

Contacts: David Penn

(301) 975-3720

email: david.penn@nist.gov

Mark Stiles (301) 975-3745

email: mark.stiles@nist.gov

B206 Metrology Building

DATA FOR ELECTRONIC

STRUCTURE

CALCULATIONS

Great advances in the calculation of materials properties from first principles have been made by the use of density functional theory. It now is possible to compute groundstate electronic structure, geometries, cohesive energies, and various response

functions for solids containing approximately 100 atoms/unit cell, with an accuracy needed for practical materials design. NIST researchers generate benchmark refer- ence data for such calculations, which can

be used by developers of new approximations or computational algorithms to test

their results against data of known high numerical accuracy. The researchers have

disseminated results for atomic total energies and orbital eigen-values for all ele- ments, as computed in several common

variants of the local density approximation, and are preparing a set of standard calculations for condensed matter systems. Cooperation is invited from developers of materials modeling software who wish to benchmark

their codes against these data or who are willing to participate in round-robin comparisons to generate new benchmarks for complex systems.

Contact:

Charles W. Clark

(301) 975-3709

email: charles.clark@nist.gov B102 Radiation Physics Building
PHYSICS LABORATORY

X-RAY

NANOTOMOGRAPHY

Computer-assisted tomography in medical imaging with a resolution of 1 millimeter is now routine. Synchrotron radiation has been used since the 1980s to produce three- dimensional images with resolution as small as 1 micrometer on geological and

biological samples. NIST research is directed toward improving the resolution to 35 nanometers in the next few years. Researchers

will study three-dimensional engineered

structures several micrometers thick,

initially focusing on Al/W/silica integrated

circuit interconnects. Recent achievements

include tomographic imaging of a torn copper foil with 100-nanometer resolution. This

research uses the 2-ID-B beamline at the Advanced Photon Source of Argonne

National Laboratory.

Contact: Zachary Levine

(301) 975-5453

email: zachary.ievine@nist.gov B102 Radiation Physics Building

X-RAY AND EUV

MICROSCOPY

Advanced imaging techniques are required

to study nanometer-scale structures of interest in the semiconductor industry, biology, and other fields. For example, as the number of levels in integrated circuits increases, techniques must be developed to inspect the

different levels and the interconnects on the sub-micrometer scale. Imaging such small

structures requires high-resolution tech- niques using high-energy photons. NIST

has available or is developing three different complementary microscopy techniques

covering the energy range from 40 electronvolts to 10 kiloelectronvolts. The first method, done in collaboration with the Advanced Photon Source, uses a step-and- scan microprobe technique to obtain images of semiconductor structures in the

0.5 kiloelectronvolts to 5 kiloelectronvolts range with the ability to construct three- dimensional images. The second technique,

in collaboration with the University of Maryland, is an extreme ultraviolet (EUV)

imaging microscope to study biological

specimens with sub-nanosecond temporal

resolution as well as high spatial resolution. The third microscope uses secondaryelectron conversion to cover the uniquely broad range from 40 electronvolts to 10

kiloelectronvolts. All three techniques have

resolution on the order of 10 nanometers to 100 nanometers.

Contact: Thomas B. Lucatorto

(301) 975-3734

email: thomas.lucatorto@nist.gov B102 Radiation Physics Building

ATOMIC PHYSICS

Division Contact: Wolfgang L. Wiese

(301) 975-3201

email: wolfgang.wiese@nist.gov

fax: (301) 990-1350 A267 Physics Building

http://physics.nist.gov/Divisions/Div842/ div842.html

VACUUM ULTRAVIOLET

RADIOMETRY

NIST researchers conduct a comprehensive

short-wavelength radiometry program,

including development and characterization

of new ultraviolet (UV) and vacuum ultraviolet (VUV) sources, detector characterization, and investigation of radiation damage to optical materials and detectors. NIST collaborates with industry to develop and test new VUV instrumentation, spec- trometer designs, and detector systems, including devices for space flight use. Other

collaborations include development and test- ing of specialized sources, narrow-band filters, and lasers, and measurements of

UV/VUV refractive indices. Researchers are

interested in developing additional collaborations to study hollow cathode lamp

sources, laser plasmas, and spark-discharge

sources. State-of-the-art radiometric facilities and advanced optical instrumentation

are maintained to support these

investigations.

Contact: John H. Burnett

(301) 975-2679

email: john.burnett@nist.gov

Al67 Physics Building

LOW-TEMPERATURE

PLASMAS

The properties of low-temperature plasmas

play a key role in the processing of materials such as semiconductors. Proper characterization of these plasmas is essential to develop accurate plasma diagnostics and

useful plasma models for specific applications. At NIST, plasma discharges are characterized utilizing optical emission spectroscopy, laser-induced fluorescence, laser

scattering, and electric probe methods. Modeling of the plasma also is an integral part

of this characterization. Discharge sources include low-pressure rf plasmas, stabilized

arcs, glow discharges, and inductively coupled plasmas.

An extensive array of laboratory equipment

is available to accomplish this characterization, including several neodymiumyttrium aluminum garnet pumped,

high-resolution (<0.1 cm" ) dye lasers; Ar ion-pumped dye and ring dye lasers; a Fizeau wavemeter; a high-throughput (f/4), high-resolution vacuum ultraviolet Fourier transform spectrometer; ultraviolet spectrometers; grazing incidence spectrometers; laboratory computers; and miscellaneous
PHYSICS LABORATORY

optics. The principal quantities measured

are particle density distributions—both spatially and temporally—for electrons, atoms,

ions, and molecules and atomic transition

probabilities. Also included are electric-field

distributions, electron and ion temperatures, and non-equilibrium phenomena.

Contact: James R. Roberts

(301) 975-3225

email: james.roberts@nist.gov A167 Physics Building

available for in-situ studies of surfaces modified by collisions with highly charged ions.

Contact: John D. Gillaspy (301) 975-3236

email: john.gillaspy@nist.gov A267 Physics Building

LASER COOLING AND

TRAPPING

Thermal motion of atoms often adversely

affects measurements. Using the radiation pressure from near-resonant laser beams, NIST scientists can cool a gas of atoms to within a few microdegrees of absolute zero. These cold atoms can be trapped by laser beams or other electromagnetic fields. Facilities for cooling and trapping atoms include continuous-wave dye, solid-state, and semi- conductor lasers. Atoms are trapped in laser

traps, magneto-optical traps, and magnetic

traps. Sodium, rubidium, cesium, and xenon atoms are cooled, trapped, and used

in such diverse applications as atomicfountain frequency standards and studies of laser-modified chemical reactions. Control

of atomic motion by lasers also is being

applied to problems such as atom inter- ferometry and laser-directed deposition of atoms on surfaces.

Contact: William D. Phillips

(301) 975-6554

email: william.phillips@nist.gov Al67 Physics Building

HIGH-PRECISION LASER

SPECTROSCOPY

Highly stabilized tunable lasers permit the

investigation of atoms and molecules with a

level of detail and precision that cannot be obtained with conventional spectroscopic

techniques. NIST work in this area ranges from observations of laser ionization of dia- tomic molecules in dense vapors to highly

precise wavelength measurements that test

the most advanced atomic theories for simple atoms. The high resolution provided by

laser scanning permits studies of spectral

line profiles, including pressure broadening,

isotope shifts, and hyperfine structure. Sensitive detection techniques, including fre- quency modulation and optogalvanic

spectroscopy and use of thermionic diode

detectors, permit observation of low concentration species in discharges and vapor cells. Typical applications of these data include wavelength standards, detection of trace ele- ments in samples, and laser isotope separation. Facilities include stabilized lasers that are tunable from the near ultraviolet to near

infrared and a unique Fabry-Perot wave- meter that is capable of real-time laser wavelength measurements with an accuracy of a few parts in 10

9

.

Contact:

CraigJ. Sansonetti (301) 975-3223

email: craig.sansonetti@nist.gov

Al67 Physics Building

FOURIER TRANSFORM

SPECTROMETRY

High-resolution Fourier transform spec- trometry allows the measurement of wide

spectral regions with a precision unobtainable with grating spectrometry. This makes

it ideally suited to the measurement of complex atomic spectra, where a spectrum of several thousand lines can be recorded with a

o wavelength precision of one part in 10 in

less than an hour. Measurements of wavelengths, hyperfine structure, isotope shifts, and line intensity ratios can be made to high accuracy. The high-resolution Fourier transform spectrometer at NIST has a resolution of 0.0025 cm"

1 and a wavelength range

of 250 nanometers to 5.5 micrometers. Suit- able sources have narrow spectral lines and include microwave discharges, hollow

cathode lamps, and Penning discharges.

RESEARCH ON HIGHLY

IONIZED ATOMS

NIST's new electron beam ion trap (EBIT)

source provides many opportunities for

definitive measurements aimed at a basic understanding of plasma processes and

atomic structure. In addition, possibilities

for using the new source for nanofabrication and ion lithography currently are being

investigated.

Ions can be generated over a wide range of

species and charge states (ultimately up to

fully stripped uranium). Ions are trapped

radially and probed with a monoenergetic

electron beam. Electrostatic end caps confine the ions axially. A large magnetic field

is applied by a superconducting magnet to pinch the electron beam to high density and

provide additional radial trapping. The carefully controlled conditions in EBIT allow

scientists to unravel complex collision processes and measure spectra with very high

accuracy. Highly charged ions can be pro- duced and observed in fluorescence with ade- quate brightness. The ion temperature can

be lowered by evaporative cooling tech- niques. Several instruments are available to characterize and probe the trapped ions, including X-ray and visible/ultraviolet spec- trometers and a laser system. An extraction system for directing beams of highly

charged ions onto surfaces is fully operational. An atomic force microscope is
PHYSICS LABORATORY

Applications include the study of spectra of transition group and rare earth elements for astrophysics and the lighting industry.

Contact:

Craig J. Sansonetti (301) 975-3223

email: craig.sansonetti@nist.gov

Al67 Physics Building

INTERACTIONS OF COLD,

TRAPPED ATOMS

New algorithms and theoretical methods are being developed to describe collisional phe- nomena currently being observed in ultra- cold neutral atom traps, which ultimately

will lead to the next generation of atomic

clocks. These interactions also play a crucial

role in the formation and stability of BoseEinstein condensates in nanokelvin atomic

gases. The ability to manipulate such condensates is a key to developing atom optics and the proposed atom laser. Developing the theory to quantitatively explain precision NIST spectroscopic measurements in atom

traps requires the development of new theoretical algorithms for solving large-scale matrix eigenvalue problems. Such algo- rithms have widespread applicability to many areas of chemistry and physics. Implementing these new methods now is feasible due to the development of state-of-the-art massively parallel processing computers.

Contact: Paul Julienne

(301) 975-2596

email: paul.julienne@nist.gov A267 Physics Building

THEORY FOR NANOSCALE

SYSTEMS AND

METROLOGIES

As the development of nanotechnology proceeds, the need for accurate models for nanoscale systems and for the metrologies to characterize these systems becomes more

critical. The NIST quantum processes group

is establishing the theoretical approaches and computational tools needed to model

complex quantum nanostructures. T-shaped

quantum wires, nanocrystallites, quantumdot quantum wells, and couple quantum

nanostructures have been modeled in the program. Near-field optics has shown great promise for achieving subwavelength resolution in optical microscopy. The quantum

processes group is developing a wide range

of models and computational algorithms to define the metrological and imaging capability of near-field optics.

Contact:

Garnett Bryant

(301) 975-2595

email: garnett.bryant@nist.gov A267 Physics Building

PRECISION X-RAY AND

GAMMA-RAY

SPECTROSCOPY

NIST has developed highly accurate spectro- scopic instrumentation for wavelength/

energy measurements from the few

kiloelectronvolt to the several megaelectronvolt regions. This measurement sys- tem is connected to the International System of Units' basic units of frequency and length by means of X-ray interferometry

and a precise lattice comparator. Principal

applications include accurate secondary

standards in the X-ray and gamma-ray

regions and measurements contributing to fundamental constants such as the kilogram and the Avogadro number. The high resolution associated with this instrumentation

also provides information on atomic and

electronic structure in matter. Several X-ray

instruments are available at NIST and a gamma-ray facility is available at the high

flux reactor at Institut Laue-Langevin,

Grenoble, France. Collaborative applications

of these capabilities are welcomed.

Contact:

Ernest G. Kessler (301) 975-4844

email: ernest.kessler@nist.gov A141 Physics Building

SYNTHETIC MULTILAYERS

For short-wavelength characterization of multilayer structures intended for larger wavelength X-ray optics, NIST researchers have established a high-performance

multiaxis diffractometer. This system provides highly collimated and monochromatic

X-ray beams, which, after reflection from

the structure under study, can be examined

for both specular and non-specular reflection characterization. The normal operating

wavelength is 0.154 nanometer, and the on-scale reflectivity covers a range of six decades. The researchers also have a thin-film production facility capable of handling a

wide variety of materials in the range of thicknesses from near one monolayer to a micrometer. The production process uses

ion beam sputtering with simultaneous

quasi-neutral beam milling to produce thin

layers and synthetic multilayers of exceptional uniformity. These capabilities currently are being applied to the development and standardization of thin-film standards

for the semiconductor industry.

Contact: Richard D. Deslattes (301) 975-4841

email: richard.deslattes@nist.gov A141 Physics Building
PHYSICS LABORATORY

APPLICATIONS OF X-RAY

TECHNOLOGY

NIST researchers have applied their extensive experience with crystal diffraction tech- niques to the production and detection of X-rays in support of space, semiconductor, and medical applications. Tunable monochromatic X-ray sources and crystal spec- trometers have been provided to perform

pre-flight or post-flight calibration services

to numerous NASA X-ray telescope missions,

including Solar Maximum Mission, P78-1, BBXRT, ASTRO-D, AXAF, and ASTRO-E.

Curved crystal spectrometers also have been

developed to measure the spectrum of X-rays emitted by the generators used in mammography. These spectrometers are used as a

non-invasive calibration system since the high-energy endpoint of the spectrum is numerically equivalent to the applied voltage. Previously developed analysis tools also have been applied to assessment of wafer

materials and homoepitaxial overlayers used in semiconductor processing. Capabilities include the design and construction of custom instrumentation and attendant data

acquisition and control systems for the pro- duction and detection of X-rays, X-ray crystal preparation and characterization, and

various X-ray spectroscopic applications. In

addition, NIST maintains facilities to per- form crystal lattice comparisons, X-ray

topography, and digital imaging of X-rays.

Contact:

Larry Hudson

(301) 975-2537

email: larry.hudson@nist.gov A141 Physics Building

OPTICAL TECHNOLOGY

Division Contact:

Albert C. Parr

(301) 975-2316

email: albert.parr@nist.gov

fax: (301) 869-5700 A207 Physics Building

http://physics.nist.gov/Divisions/Div844/ div844.html

LUMINESCENCE

SPECTRAL RADIOMETRY

Luminescence techniques have broad appli- cation in virtually every scientific field, including radiation measurement; remote

sensing; analytical chemistry; and characterization of laser, semiconductor, and

superconductor materials. The accurate

spectral radiometric quantitation of light emission is an exacting task requiring painstaking radiometric measurements and

knowledge of the fundamental chemical and physical processes represented by these

radiative transitions. Standard lamps, both

radiance and irradiance, and silicon detector radiometry provide the accuracy base

for the spectral and quantum efficiency measurements. NIST is investigating luminescent phenomena such as photo-, chemi-,

thermo-, electro-, and bioluminescences.

Researchers are conducting luminescence

radiometric research in the near-ultraviolet,

visible, and near-infrared spectral regions and are developing accurate standards and measurement procedures for these regions.

Facilities available for this research include

various laser and lamp sources, a reference

spectrofluorimeter, and a low-light-level

spectroradiometer.

Contact: Ambler Thompson

(301) 975-2333

email: ambler.thompson@nist.gov A320 Metrology Building

PHOTOMETRY

Photometry is the science of radiometric measurement of the response function of human vision. The candela, one of the seven base units of the International System

of Units, is the basic unit of photometry. The

Optical Technology Division has established a new detector-based candela that has improved the accuracy of these measure- ments by a factor of two. This improvement

has become the basis for improved accuracy

of all other photometric measurements

offered by the division.

Improved levels of accuracies are needed in industry to ensure the production of higher

quality products so that U.S. companies can

compete in the growing international market. Accurate light measurements are essential to the production of various lighting

products such as light bulbs, discharge

lamps, lighting fixtures, automobile headlights, and aircraft lamps. Accurate light measurements also are essential in the pro- duction of information displays such as cath- ode ray tubes, flat-panel displays, light-emitting diodes, and various other optical components.

Another unit in photometry is the lumen,

which is the measure of the total light out- put of lamps. The lumen is especially important to the lighting industry, where millions

of lamps are produced every week. The

Optical Technology Division recently has

established a new lumen unit based on

the detector-based candela that provides

the highest accuracy levels of lumen

measurements.

Contact:

Yoshi Ohno

(301) 975-2321

email: yoshihiro.ohno@nist.gov A320 Metrology Building
PHYSICS LABORATORY

HIGH-ACCURACY

CRYOGENIC RADIOMETRY

The Optical Technology Division bases many of its radiometric measurement

scales, such as detector spectral responsivity, photometry, radiance, and irradiance, on a high-accuracy cryogenic radiometer (HACR). Cryogenic radiometers work on the

principle of electrical substitution, where

the temperature rise in a receiving cavity caused by optical heating is reproduced by

electrical heating. Electrical substitution measurements tie the optical watt to electrical standards.

The HACR measures the optical power of single laser lines with an uncertainty of 0.02 percent or better and calibrates transfer

detectors to disseminate a spectral responsivity scale. NIST researchers continue to improve the HACR base measurements and

the optical transfer devices in different wavelength regions. Optical detector calibrations from the ultraviolet through the infrared are based on HACR measurements and are used

in environmental, industrial, defense, and

space applications. Cryogenic radiometry

reduces the base uncertainty in the optical calibrations transferred to these customers.

Contact: Jeanne Houston

(301) 975-2327

email: jeanne.houston@nist.gov A320 Metrology Building

THERMAL RADIOMETRY

NIST researchers are investigating the use of thermal imaging cameras as a temperaturemeasuring tool. These devices may prove to be very useful in determining the quality of products and in investigating changes in dif- ferent processes. Research projects involve

the development of large-area blackbodies, use of Pt-Si as detector standards, and the characterization of thermal imaging cameras. Equipment available includes several heat-pipe blackbodies, a Pt-Si camera, and

an infrared radiometer.

Contact: Robert Saunders

(301) 975-2355

email: robert.saunders@nist.gov

B208 Physics Building

NEAR ULTRAVIOLET

RADIOMETRY

The measurement of terrestrial solar irradi- ance at ultraviolet-B (UV-B) wavelengths

(200 nanometers to 400 nanometers) is being investigated by NIST researchers to provide improved techniques and standards

in this spectral region. This work is important to networks that monitor solar UV-B

irradiance, to scientists studying the biological effects of ultraviolet radiation, and to researchers investigating the aging of materials. Specific projects include the develop- ment of experimental techniques for characterizing instruments that measure UV-B irradiance, spectral irradiance standards for use at field sites, and a transportable reference spectroradiometer. A

permanent UV-B monitoring site, equipped

with a broad suite of instruments, is maintained at NIST, and researchers coordinate

intercomparisons among spectroradiometers from different monitoring networks.

Contact: Ambler Thompson

(301) 975-2333

email: ambler.thompson@nist.gov A320 Metrology Building

SPECTRAL RADIOMETRY

Research and development programs at NIST span many activities associated with

the measurement of optical radiation, cover- ing the spectrum from 200 nanometers in the ultraviolet to the far infrared. Included

are spectral radiance and irradiance measurements for many varied applications, such

as manufacturing process control, remote

sensing of the Earth's environment, and

defense needs. Researchers at NIST take demanding problems, such as the spectro- photometric measurement of dense optical media, and develop the detector metrology

to perform the measurements and relate them to the stable, U.S. radiometric meas- urement base. Emphasis is placed on solidstate photodiode metrology and its application to all areas of radiometry,

especially calibration services.

Several well-equipped laboratories for optical measurements in the ultraviolet, visible, and infared spectral regions are available

for use, and new facilities are being devel- oped to enable scientists and engineers to conduct research on detector improvements,

detector applications, and optical properties

of materials.

Contact: Joseph Dehmer

(301) 975-3216

email: joseph.dehmer@nist.gov A320 Metrology Building
PHYSICS LABORATORY 153

INFRARED SPECTRAL

RADIOMETRY

Researchers at NIST are developing devices and techniques for high-precision measure- ments of radiant power in the 2-micrometer

to 30-micrometer spectral region to enable

characterization of spectral sources, optical

components, and detectors. Novel experi- ments are being planned to investigate

physical and chemical processes in materials and molecular structures. State-of-theart radiometers, a cryogenic blackbody with

multiple apertures, lead salt lasers, spectral instrumentation, and solid-state infrared

detectors have been acquired. A unique facility called the Low-Background Infrared Radiation Facility is dedicated to this research and development effort. An Infra- red Detector Comparator Facility, equipped

with a prism-grating monochromator and a

Fourier transform infrared spectrometer for characterizing detectors at ambient back- ground, has been completed and soon will

offer calibration services.

Related research projects are investigating methods for measuring the optical density of

filters using laser heterodyne technology and determining the spatial uniformity and

linearity in the response of infrared detectors. Collaborative research opportunities

exist in measuring the optical properties of materials and fundamental molecular struc-

| tures and in developing novel detectors.

Contact: Raju Datla

(301) 975-2131

email: raju.datla@nist.gov B208 Physics Building

SPECTROSCOPIC

APPLICATIONS

The NIST spectroscopic applications group employs advanced spectroscopic methods

using state-of-the-art lasers and microwave

frequency sources in conjunction with molecular beam techniques to elucidate the

details of chemical reactions that are important in a wide variety of industrial processes, including catalysis, combustion, chemical

vapor deposition, and drug design. These benchmark studies provide the means for real-time optimization of chemical processes and on-line monitoring for pollution

control.

The group also carries out spectral studies of species important in atmospheric processes with particular emphasis on the reaction chemistry of ozone. The work provides spectral data for these species, which are used by

scientists modeling the chemistry of the upper atmosphere. A recent thrust of the group centers around the determination of physical and electrical properties of numerous new chemical compounds that are being

investigated by industry for use as alternative refrigerants.

Contact: Richard Suenram

(301) 975-2165

email: richard.suenram@nist.gov B208 Physics Building

NON-LINEAR OPTICAL

MEASUREMENTS

Non-linear optical methods are used to measure properties of interfaces that may be found at the surfaces of materials, in thinfilm systems, or buried in layered materials. An example is the technique of sum fre- quency generation (SFG), in which two

laser pulses at different frequencies combine

to produce light at their sum frequency with an efficiency that depends on the broken symmetry at the interface. With femtosecond

laser pulses, SFG provides a time-resolved

optical diagnostic uniquely sensitive to inter- face structure. Measurements include spectroscopic characterization of electronic structure at buried epitaxial interfaces, ultrafast monitoring of carrier dynamics at semi- conductor interfaces, assessment of the

structure and quality of thin films, and

vibrational^ resonant SFG of organic films such as self-assembled monolayers. This

research is a collaboration with the Chemical Science and Technology Laboratory. Resources include femtosecond laser sources

for generating ultrafast pulses in the infra- red through ultraviolet and instrumentation

for spectral, directional, and polarization

analyses of surface-generated optical signals.

Contact: John Stephenson

(301) 975-2372

email: john.stephenson@nist.gov

B208 Physics Building

OPTICAL SCATTERING

MEASUREMENTS

Studies are being made of how materials'

properties and surface topography affect the

distribution of light scattered from surfaces, with an aim to developing standard meas- urement methods and standard artifacts for use in industry. The description of light scat- tered from surfaces is a useful metrological

tool for appraising performance of optical elements and for evaluating material processing. Applications include evaluation of highly polished optical surfaces, bulk opti- cal materials, surface residues, and diffuse scattering materials. Experiments are under way to correlate the optical scatter from sili- con wafers with properties such as haze, sur- face microroughness, and particulate

contamination, with a goal to facilitate optical scattering measurements in assemblyline applications. The utility of polarization

analysis of scattered light also is being investigated. Parallel research in near-field optics

is elucidating the connection between microscopic features of the surfaces and the

far-field optical scattering pattern. Facilities
PHYSICS LABORATORY

are available for laser-based measurements

of the bidirectional reflectance distribution function of light-scattering materials and

surfaces. Work is under way on theoretical modeling of the bidirectional reflectance distribution function. Clean rooms are available for handling optical samples.

The bidirectional characterization of optical

scatter from surfaces is a useful diagnostic

in evaluating elements contained within

large optical systems that require the minimization of scattered light. This information is needed for the development of

ring-laser gyroscopes and telescopes. It also

is used for the characterization of materials

for use in stray light reduction in thermal

control and inspection processes in optical

manufacturing settings. NIST research projects involve the development of a multi- angle scattering reference instrument and

the development of measurement methodologies and Standard Reference Materials

for the spectral range from the ultraviolet to

the infrared region.

Contact: Thomas Germer

(301) 975-2876

email: thomas.germer@nist.gov A320 Metrology Building

NEAR-FIELD SCANNING

OPTICAL MICROSCOPY

NIST researchers are using near-field scan- ning optical microscopy (NSOM) as a quantitative technique for non-invasive optical measurements on previously inaccessible length scales. So far, lateral resolution on

the order of 20 nanometers has been

achieved with this technique, and vertical

resolution of less than 1 nanometer may be

possible. The researchers are building well- characterized microscopes and small light sources and are working on methods to determine the resolution of commercially

available near-field microscopes. At a funda- mental level, this means understanding the mechanisms that generate contrast in

different materials and modeling the fields

around small light sources as they interact with various materials and surface features. The group collaborates with other NIST

researchers interested in applying near-field microscopy to problems in chemical, optical, and semiconductor technology. Applications include mapping of optical properties

of nanostructured materials, investigations

of structure in biological membranes,

and near-field measurements of photonic

structures. Resources include NSOM measurements in the visible, NSOM tip characterization, theoretical modeling of probe-surface interactions and optical

contrast mechanisms, and access to complementary scanning microscopies such as scanning electron microscopy and atomic

force microscopy.

Contact:

Lori Goldner

(301) 975-3792

email: lori.goldner@nist.gov A320 Metrology Building

TIME-RESOLVED

INFRARED

SPECTROSCOPY

Ultrashort laser pulses are used to observe

fast processes that occur in the condensed

phase. NIST researchers have developed

unique femtosecond infrared spectroscopic

techniques to study highly excited vibrational states, vibrational energy transfer, photochemical reactions, and the dynamics

of hydrogen bond formation and rupture. The measurements identify transient species and determine energy transfer rates, which

serve to improve models of condensed phase

chemistry. Current collaborations with

industry include measurements on catalytic systems and polymerization reactions. They

also are developing sources of femtosecond

pulses in the terahertz frequency region to be used to probe directly quantum-well electron and solid-state phonon dynamics.

Resources include femtosecond laser sources generating ultrafast pulses in the infrared through ultraviolet, infrared and visible

multielement detectors, and instrumentation for capturing transient spectra of samples with single laser pulses.

Contact: Edwin Heilweil

(301) 975-2370

email: edwin.heilweil@nist.gov

B208 Physics Building

ELEMENTARY CHEMICAL

REACTION DYNAMICS

Researchers use laser pulses to observe and

manipulate fundamental molecular trans- formations such as bond breaking and bond

formation in order to develop an atomiclevel understanding of reactions important

in combustion and propulsion chemistry, in

the chemistry of the upper atmosphere, and

in orbital environments. Current efforts emphasize elementary reactions of oxygen atoms with hydrogen, water, hydrocyanic

acid, and methane. The experiments use

state-resolved nanosecond and time-resolved femtosecond spectroscopic techniques and

molecular beam methods to produce data to

test quantum chemical models of these benchmark systems. Resources include

intense, narrow bandwidth, tunable laser sources spanning the infrared to vacuum

ultraviolet; tunable femtosecond lasers; laser-induced fluorescence and photoionization mass spectrometric detection of trace gas phase species; and pulsed supersonic jet sampling of gases.

Contact: John Stephenson

(301) 975-2372

email: john.stephenson@nist.gov

B208 Physics Building
PHYSICS LABORATORY

IONIZING RADIATION

Division Contact:

Bert M. Coursey

(301) 975-5584

email: bert.coursey@nist.gov

fax: (301) 869-7682 C229 Radiation Physics Building

http://physics.nist.gov/Divisions/Div846/ div846.html

RADIATION PROCESSING

To enhance quality-control methods used in industrial radiation processing of foods and

in the production and use of medical

devices, electronic components, and poly-

! mers, NIST researchers are developing standardization and measurement assurance methods related to industrial high-dose

j applications of ionizing radiation. As part of

'] this program, they are investigating radiation, chemical mechanisms, and kinetic

studies applied to chemical dosimetry sys-

|j terns in the condensed phase, including liquids, gels, thin films, and solid-state

detectors.

They also plan to examine sensor materials

j such as doped plastics, solid-state matrices,

' fiber optics, organic dye solutions, semiconductors, scintillators, amino acids, metalloporphyrins, and organic or inorganic

1 radiochromic and luminescent aqueous

solutions and gels. A number of analytical methods will be used, including transmission and fluorescence spectrophotometry and electron spin resonance spectrometry as

i well as optical waveguide analysis and pulse

radiolysis.

Various X-ray and gamma-ray sources and

electron accelerators with energies in the 0.1-megaelectronvolt to 10-megaelectronvolt range are used in this work. Conventional ultraviolet, visible, and infrared spectrophotometers; high-intensity gammaray sources; pulsed and continuous beam

electron accelerators; and organic-chemical

analytical equipment also are available.

Contact: Marc F. Desrosiers (301) 975-5639

email: marc.desrosiers@nist.gov C229 Radiation Physics Building

MEASUREMENT QUALITY

ASSURANCE

Credibility of ionizing radiation measure- ments has been a critical issue for the U.S. radiation, medical diagnostics and therapy, occupational safety, industrial, energy,

defense, and environmental communities. To this end, NIST scientists disseminate the standards and technology required for reli- able measurement of ionizing radiation to

federal, state, and local radiation control programs as well as to the medical, industrial, and defense communities. In addition, NIST researchers monitor and evaluate

radiation measurements needs; participate

in radiation research, metrology develop- ment, and quality control activities; and

develop methods for improving the accuracy

of field measurements through a national system of secondary standards laboratories.

NIST has a strong influence on the design and implementation of measurement quality assurance programs that are accredited under the National Voluntary Laboratory

Accreditation Program (secondary calibration laboratories for ionizing radiation and

personnel dosimetry programs), the Confer- ence of Radiation Control Program Directors (diagnostic X-radiation), Health Physics

Society (private-sector calibration laboratories), and American Association of Physicists

in Medicine (therapeutic radiation). Pro- grams currently being developed will

address measurement quality assurance needs in sectors that include industrial processing, radio-bioassay, and radioanalyses for environmental remediation and waste management.

In support of the accreditation programs, NIST provides technical expertise for laboratory technical document review and evaluation, traceability to the national physical standards through performance evaluation

testing, and on-site assessments. The major

research thrust is the development of a wide

variety of appropriate transfer standard instruments and materials.

Contact:

Bert M. Coursey

(301) 975-5584

email: bert.coursey@nist.gov C229 Radiation Physics Building

NEUTRON PHYSICS

NIST researchers are exploring three major

areas of fundamental neutron physics: neutron interferometry, laser polarization of neutron beams, and various coupling coeffi- cients of the weak interaction. The Neutron

Interferometer and Optics Facility (NIOF) in the cold neutron guide hall has achieved unprecedented levels of phase contrast and

stability. Work is under way at this new facility on the development of phase contrast imaging, on a measurement of the neutronelectron scattering length, and on neutron tomography. The NIOF also will operate part-time as a user facility for university and

industrial scientists. At another location in the guide hall, development is in progress on neutron spin filters, based on laser polari- zation of %e. These neutron polarizers offer advantages over conventional methods in experiments on parity-violating aspects of neutron beta decay and in studies of magnetic materials. This project also is providing assistance to medical researchers who

employ polarized %e for improved magnetic resonance imaging of the lung.
PHYSICS LABORATORY

Another major research and user facility is

the Fundamental Physics Station. At this station three experiments have been carried out in collaboration with major universities:

a beam measurement of the free neutron

lifetime, a measurement of parity nonconserving neutron spin rotation in liquid

4 He, and a search for time-reversal asymmetry in neutron beta decay. At present, a

potentially much more accurate measure- ment of the neutron lifetime employing

trapped ultracold neutrons is being carried out in collaboration with Harvard University, Los Alamos National Laboratory, and

Berlin's Hahn Meitner Institute.

Contact: David Gilliam

(301) 975-6206

email: david.gilliam@nist.gov A106 NIST Center for Neutron Research

NEUTRON DOSIMETRY

NIST physicists develop and maintain standards for neutron dosimetry, both at the very high fluence levels appropriate to materials damage studies for nuclear reactors and at

the much lower levels appropriate to standardization of radiation protection instru- ments. Standard neutron fields at NIST and

at the University of Michigan have been

characterized to provide test irradiation

fields for the neutron dosimetry employed in assurance of materials integrity at nuclear power reactors in the United States. NIST scientists also collaborate with engineers and

scientists from industry and the Nuclear

Regulatory Commission in drafting regulatory guides for accurate measurements in neutron dosimetry at these reactors. Another

set of standard neutron fields at much lower

fluence rate levels is maintained at NIST for calibration of radiation protection instru- ments and personnel dosimeters. Efforts are

under way to establish and maintain accreditation of other laboratories so that routine

calibrations of neutron radiation protection instruments can be taken over by the private

sector and by central military laboratories.

Contact: David Gilliam

(301) 975-6206

email: david.gilliam@nist.gov A106 NIST Center for Neutron Research

TIME AND FREQUENCY

Division Contact: Donald B. Sullivan

(303) 497-3772

email: dbs@boulder.nist.gov

fax: (303) 497-6461

Mailcode 847.00

Boulder, Colo. 80303-3328

www.boulder.nist.gov/timefreq

ION STORAGE RESEARCH

This program investigates the applications

of ions, such as

19%g+

, for high-accuracy

frequency standards. The ions are stored in ion traps—devices that use electric, or a combination of electric and magnetic, fields

to suspend the ions in free space. Laser

radiation is used to cool the ions to temperatures on the order of a millikelvin, so the second-order Doppler shift (a serious prob- lem in high-accuracy frequency standards)

is extremely small. In some cases, ions are cooled even further, approaching the zero- point motion limit set by Heisenberg's uncertainty principle. It is expected that frequency

standards based on laser-cooled, stored ions

will be much more accurate than the best current standards, which are based on

cesium atomic beams. Research also is under way on related topics, such as the physics of non-neutral plasmas, quantum

optics, quantum measurements, laser

frequency stabilization, and non-linear

optical sources.

Contact: David J. Wineland

(303) 497-5286

email: wineland@boulder.nist.gov

Mailcode 847.10

Boulder, Colo. 80303-3328

ATOMIC BEAM

FREQUENCY STANDARDS

The first atomic frequency standard, based on ammonia, was built in 1950 at NIST

(then the National Bureau of Standards) in Washington, D.C. Since then, NIST has constructed a series of seven standards (based on cesium beams) with performances

improving at a rate of better than an order

of magnitude every 10 years. NIST-7, intro- duced in 1993, is the most recent in this

series. It is based on optical state selection and state detection rather than the more

traditional magnetic methods and has an

uncertainty of 5 x 10" 15 A cesium-fountain

frequency standard has been constructed as a successor to NIST-7. The main advantages

of this concept are the reduction in the Doppler shift and the increase in atom obser- vation time. These severely limit the per- formance of NIST-7. The work in this program involves research on laser pumping

of the states of atoms, improvements in atomic-beam ovens, and the development of

digital servo-control systems for more reliably controlling critical parameters.

Contact: Robert E. Drullinger

(303) 497-3183

email: rdrullinger@boulder.nist.gov Mailcode 847.20

Boulder, Colo. 80303-3328
PHYSICS LABORATORY

NOISE IN ELECTRONIC

AND OPTICAL SYSTEMS

NIST has developed systems for making

phase-noise and amplitude-noise measure- ments over a broad dynamic range of carrier frequency (into the millimeter range) and

Fourier frequency7 (up to 10 percent of the

carrier frequency). The accuracy of measure- ment is typically 1 decibel or better depending on the frequency range. These systems

provide the basis for specifications now aris- ing in communication, radar, and other aerospace equipment. Signals at higher millimeter and optical frequencies also can be characterized by beating them against a stable optical reference. A wide range of noise measurement equipment and systems for analyzing the output data is available. Most

recently, this unique measurement capability has been applied to the study of phasemodulation and amplitude-modulation

noise in bipolar-junction-transistor circuits. This work has led to a better understanding

of noise processes in these circuits, and

design rules for low noise performance have

been developed. These rules can provide for a noise reduction (close to a carrier) of as much as 20 decibels.

Contact:

Fred L. Walls

(303) 497-3207

email: walls@boulder.nist.gov Mailcode 847.00

Boulder, Colo. 80303-3328

STATISTICAL ANALYSIS OF

TIME-SERIES DATA

Noise processes in high-performance clocks and oscillators are often not white (fre- quency independent), so the usual variance

does not converge. The two-sample vari- ances developed to handle such noise have become standards widely used in the specifi- cation of noise in systems demanding highspectral purity. These measures have been

applied with some success to other measure- ment data. NIST researchers are continuing

development of still better variances and

have written software for the efficient calculation of a number of these measures. Outputs can be represented in both the frequency and time domains.

Contact: David A. Howe

(303) 497-3277

email: dhowe@boulder.nist.gov

Mailcode 847.40

Boulder, Colo. 80303-3328

TIME TRANSFER AND

NETWORK

SYNCHRONIZATION

NIST has broad expertise in time transfer, particularly using satellite methods, that can be applied to synchronization of widely

distributed network nodes. Telecommunications and electrical power networks are examples of systems requiring such synchronization. A NIST-developed, common-view

method using global positioning system (GPS) satellites provides time transfer accuracy of better than 10 nanoseconds, and

two-way exchange of signals through tele- communications satellites offers even

higher performance. NIST owns and operates a number of specialized GPS receivers and satellite Earth stations needed for such

work, and the NIST time scale provides

unsurpassed stability as a reference for remote synchronization.

Contact: Thomas E. Parker

(303) 497-7881

email: tparker@boulder.nist.gov Mailcode 847.50

Boulder, Colo. 80303-3328

FAR-INFRARED

SPECTROSCOPY

NIST has unique capabilities for highresolution studies of the spectra of atoms and molecules in the far-infrared region.

The methods of tunable far-infrared spec- troscopy and laser magnetic resonance (LMR) were developed by NIST, and several

of each of these spectrometers currently are providing high-resolution measurements on

spectra important in both space studies and

studies of the chemistry of the upper atmosphere. Pressure-broadening studies at high

resolution also have been performed, providing the basis for locating air pollutants at high altitude. Recent improvements in the NIST LMR systems have improved dramatically their sensitivity, making them especially useful in searches for difficult-todetect molecular species such as free radicals and molecular ions.

Contact: Kenneth M. Evenson

(303) 497-5129

email: evenson@boulder.nist.gov

Mailcode 847.00

Boulder, Colo. 80303-3328

HIGH-PERFORMANCE

DIODE LASERS

Diode lasers are used widely in many appli- cations where spectral and spatial purity is not critical, but they could be used in a variety of other applications if these properties were improved substantially. Such applications include analytical chemistry and sens- ing of trace impurities or pollutants as well

as narrow-line sources for length standards and optical manipulation of atoms and

molecules. Recognizing the broad range of measurement applications for highperformance diode lasers, NIST has devel- oped a program aimed at developing methods for controlling the output characteristics of these versatile and inexpensive

lasers. The program selects specific practical
PHYSICS LABORATORY

applications and works on the system

designs needed to provide solutions. Current

projects include a calcium-stabilized laser

for use as a length reference, methods for synthesizing signals in the optical region,

and laser-spectroscopy methods for detect- ing trace impurities.

Contact: Leo Hollberg

(303) 497-5770

email: hollberg@boulder.nist.gov Mailcode 847.80

Boulder, Colo. 80303-3328

QUANTUM PHYSICS

Division Contact: James Faller (303) 492-8509

email: fallerj@jila.colorado.edu

fax: (303) 492-5235

JILA, Boulder, Colo. 80309-0440

http://jilawww.colorado.edu

BOSE-EINSTEIN

CONDENSATION

The discovery of Bose-Einstein condensation (BEC) by JILA scientists in June 1995 has opened up whole new areas of research. JILA

(formerly the Joint Institute for Laboratory

Astrophysics) is a joint venture of NIST and

the University of Colorado. In BEC, atoms

cooled to temperatures as low as 10 nanokelvin undergo a phase transition in which a large percentage of the atoms all take on exactly the same quantum wave

function, becoming completely indistin- guishable from one another. Preliminary

studies on low-lying phonon-like excitations

will develop into measurements on vortices and viscosity. Thermal behavior near the

critical temperature and the kinetics of condensate formation are also promising topics

for study. The implications of condensate formation for precision metrology must be

explored as well, including theoretically pre- dicted coherent atom beams, dubbed bosers.

Contact:

Eric A. Cornell

(303) 492-6281

email: cornell@jila.colorado.edu

JILA, Boulder, Colo. 80309-0440

THIN FILMS

Images of amorphous silicon films taken by a scanning tunneling microscope (STM)

at various stages throughout the growth

process show particles 3 nanometers to

5 nanometers in size forming in the vapor and bonding to the film surface during

growth. If these particles can be prevented from forming or reaching the surface, it should be possible to improve the film's ability to convert light into electrical current. A

laser scattering system is being developed to detect the silicon/hydrogen clumps as they

are forming.

In another project, lines of aluminum as small as 3 nanometers in width have been

deposited on silicon surfaces using the elec- tron beam and electric field produced at the

tip of an STM. Independent auger electron spectroscopy studies of the electron-induced

deposition of aluminum show nearly pure aluminum deposits.

Contact: Alan C. Gallagher

(303) 497-3936

alang@jila.colorado.edu

JILA, Boulder, Colo. 80309-0440

LASER DEPOSITION OF

THIN FILMS

Evidence suggests that laser-deposited materials can attain better film properties at lower processing temperatures than materials deposited by normal thermal means. The

microscopic basis for the effect of kinetic- energy-enhanced epitaxy has been demonstrated at NIST for the first time. An

apparatus has been developed to produce a

neutral cobalt atom beam with a controlled energy. When cobalt atoms are deposited onto silicon at thermal energy, most of the atoms reside on the surface. However, deposition of cobalt atoms on a silicon(lOO) wafer

at enhanced kinetic energies mimics substrate heating in the 500 kelvin range with

thermally deposited cobalt, in which the

silicide material forms.

Contact: Stephen R. Leone

(303) 497-3505

srl@jila.colorado.edu

JILA, Boulder, Colo. 80309-0440

MOBILITY OF

CLUSTER IONS

New methods have been established at NIST

to measure the mobilities of ions clustered with water and other molecules important

in the upper atmosphere. Ions are produced

in a mass-selected ion source and injected

into a flow tube where they are converted to

clusters by three-body reactions with a sol- vent molecule. The mobility of the cluster ions is measured by the arrival times of ion

"packets" at a mass spectrometer detector, following a pulsed depletion of a small frac- tion of the ions at two places in the flow

tube. The method has been applied for benzene dimer ions, water cluster ions, ammonia cluster ions, and mixed clusters.
PHYSICS LABORATORY 159

In general, the size of the cluster ion deter- mines the mobility in helium in a predict- able fashion, but for collisions with molecules that have strong dipole moments,

remarkably small mobilities are observed. The additional strong attractive forces and

internal degrees of freedom of the molecules

play a major role, causing the small

mobilities.

Contact: Stephen R. Leone

(303) 497-3505

srl@jila.colorado.edu

JILA, Boulder, Colo. 80309-0440

RESEARCH

FACILITIES

SYNCHROTRON

ULTRAVIOLET RADIATION

FACILITY III The NIST Synchrotron Ultraviolet Radiation

Facility (SURF) is used as a national stand- ard of spectral irradiance for radiometric

applications and a spectrometer calibration

facility. The facility also is used for extreme

ultraviolet and infrared microscopy and for fundamental research in the following

areas: optical properties of materials; elec- tron density of states in solids; surface characterization; photoelectron spectroscopy; atomic and molecular absorption spectros- copy; molecular kinetics and excitation and

ionization dynamics; and radiation interac- tions with matter. Currently SURF II has been disassembled completely to make way

for an improved and upgraded SURF III

facility, which is expected to be completed in June 1998.

Contact: Robert P. Madden

(301) 975-3726

email: robert.madden@nist.gov B119 Radiation Physics Building

MAGNETIC

MICROSTRUCTURE

MEASUREMENT FACILITY

The magnetic microstructure of materials can be measured with very high spatial resolution by a technique called scanning electron microscopy with polarization analysis

(SEMPA). An ultrahigh-vacuum electron microscope has been modified so secondary

electrons from the sample can be analyzed

for their electron spin polarization. This

allows for a measurement of the surface

magnetism with moments both in the plane and perpendicular to the plane of the sample.

CAPABILITIES SEMPA allows the simultaneous observation

of surface microstructure and surface magnetic domains with a resolution as high as 20 nm.

APPLICATIONS

This unique measurement facility can be used for research in magnetic thin films, high-coercivity magnetic materials, highdensity magnetic storage media, and other advanced magnetic materials.

AVAILABILITY These facilities are available for collaborative research by NIST and outside scientists in areas of mutual interest on a timeavailable basis.

Contact: John Unguris

(301) 975-3712

email: john.unguris@nist.gov B206 Metrology Building

HIGH-RESOLUTION UV

AND OPTICAL

SPECTROSCOPY FACILITY

Accurate atomic data for neutral atoms and ions are required in support of hightechnology products and manufacturing

processes as well as advanced scientific applications. The primary source of such data is high-resolution optical spectroscopy. Spectrometers in NIST's High-Resolution Ultraviolet and Optical Spectroscopy Facility are the most powerful in the world for observations of emission and absorption spectra in the soft X-ray to near infrared regions. The

10.7-meter grazing-incidence and normalincidence vacuum spectrographs permit

observations from 3 nm to 600 nm with

resolving powers of 70,000 to 400,000 and

wavelength uncertainties as low as 0.0002 nm. In the visible and near-infrared region, an echelle spectrograph provides resolving

STABILIZED LASERS

The remarkable price reduction of diode

lasers, taken with cost-effective frequency

stabilization approaches, leads to consideration of possible future widespread exploration of frequency-stabilized diode lasers in a

vast range of new applications. Traditional

interferometric control systems profit from

the laser system's increased performance

along with its decreased cost and generated

heat. A new concept in development will allow stabilization to produce a constant

laser wavelength for interferometric applications. Advanced low noise tilt and displace- ment sensors now can be designed usefully and may become widespread when the stabilized laser system cost is decreased by one

order of magnitude or more.

Contact: John L. Hall

(303) 497-3126

email: jhall@jila.colorado.edu

JILA, Boulder, Colo. 80309-0440
PHYSICS LABORATORY

powers exceeding 1,000,000. NIST's new

high-resolution Fourier transform spec- trometer will be capable of observations from 200 nm to 18 (J,m with unmatched

resolution and wavelength accuracy. A variety of discharge sources are used to excite spectra of neutral atoms and ions stripped of up to 20 electrons. Species up to 40 times

ionized are observed in plasmas created by

ablating samples with a high-power laser. Current NIST research includes development

of wavelength standards used for calibration

of the high-resolution spectrograph on the Hubble Space Telescope, observations of

transitions in highly ionized atoms for plasma diagnostics in tokamaks, develop- ment of a promising new scheme for an

extreme ultraviolet laser, and precise isotope

shifts of mercury wavelengths needed to

interpret ultraviolet spectra of stars.

Contact: William C. Martin

(301) 975-3213

email: wmartin@nist.gov Al67 Physics Building

LOW-BACKGROUND

INFRARED RADIATION

FACILITY

In the NIST Low-Background Infrared Radiation Facility, radiant background

noise levels less than a few nanowatts are attained in a large (60 cm diameter x 152 cm long) vacuum chamber by cooling inter- nal cryoshields to temperatures less than

20 K using a closed-cycle helium refrigerator system. An absolute cryogenic radiometer (ACR) of the electrical substitution type

that operates at 2 K to 4 K is housed in the chamber.

CAPABILITIES The ACR is a broadband detector with a flat response from the visible to the long wavelength infrared spectral region. It can measure power levels of 20 nW to 100 W at its 3-centimeter-diameter aperture within an

uncertainty of less than 1 percent. The ACR

has a resolution of 1 nW, and its time constant is about 20 s.

APPLICATIONS

This unique facility can be used to measure

total radiant power from sources such as cryogenic blackbodies. Ongoing improve- ments will allow measurement of the spectral distribution of radiation from sources and characterization of infrared detectors and optical components.

AVAILABILITY The facility is operated by NIST staff in support of user infrared calibrations. It is avail- able for collaborative research by NIST and

outside scientists in areas of mutual interest.

Contact: Raju Datla

(301) 975-2131

email: raju.datla@nist.gov

B208 Physics Building

CONTROLLED

BACKGROUND

RADIOMETRIC FACILITY

Infrared radiometry has an important role

in space-based civilian, defense, and industrial applications. A facility to maintain an

infrared scale for specialized applications was developed with funding from NIST, NASA, and the Department of Defense. In

particular, the capability for measurements

on large-area, vacuum-operational, black- body sources operated from 200 K to about 400 K is being established. These measure- ments will be traceable to NIST via infrared radiometry through the radiance temperature of the source. An example of the type of

scientific activity that the NIST facility supports is the use of satellites for the determi- nation of temperature, based on radiance

measurements, for the Earth's surface and

atmosphere. These measurements are the

basis for the study of global warming. A goal

of the facility will be the development of infrared radiometers, which will be used to intercompare large-area blackbody sources used by contractors for NASA's Mission to Planet Earth Project.

This facility is not limited to infrared measurements. The capability to make comparisons of large area visible sources also will be

possible. For both infrared and visible sources, users are able to bring their sources

to NIST for calibration. This facility also is used for hosting intercomparisons of field radiometers, user sources, and training of key personnel. A multipurpose classroom is available where short courses and workshops on radiometry can be held.

Contact:

Carol Johnson

(301) 975-2322

email: cjohnson@nist.gov B208 Physics Building

MEDICAL-INDUSTRIAL

RADIATION FACILITY

NIST operates an electron accelerator as the heart of a new user facility for the medical and industrial radiation communities. The

Medical-Industrial Radiation Facility (MIRF) is based on a rf-powered, traveling- wave electron linac donated by the Radiation Therapy Center of the Yale University New Haven Hospital. This reconfigured accelerator provides electron energies from 7 MeV

to 32 MeV at average beam currents of up to

0.1 mA. In addition to the original beamsteering system and medical-therapy scanner/collimator head, three additional beam

ports and a switching magnet have been added at NIST. The flexibility afforded by

access to these four beam lines allows NIST

to address issues in radiation metrology,

radiation effects, and the uses of electron and high-energy photon beams.
PHYSICS LABORATORY

CAPABILITIES The medical beam line can provide electron

doses of up to 5 Gy/min at the patient location and is equipped with a target to produce

a 25 MeV bremsstrahlung beam as used in high-energy photon therapy. On other beam

lines, dose rates in excess of 1 kGy/s over a small area have been achieved with electrons, and exposure rates of about 2,500

R/min can be attained with suitable bremsstrah-lung convertors to produce high- energy photon beams used in industrial radiography.

APPLICATIONS MIRF offers unique opportunities for medical and industrial research. At the facility, a number of organizations are collaborating on a variety of projects:

• Medical dosimetry. Medical linacs are used for treating approximately 500,000 cancer patients annually at some 1,300 treat- ment facilities in the United States. Among

the medical dosimetry applications of MIRF

are the development and testing of instru- ments and dosimetry systems for use in clinical facilities as well as investigations into

shielding requirements for the radiation

scattered from the patient.

• Radionuclide production. Through photonuclear reactions, radioisotopes can be produced with high-energy electron accelerators as an alternative to the use of nuclear reactors. Applications on MIRF

include production tests of radionuclides for

use in nuclear medicine.

• Radiography. The facility provides for

studies pertinent to industrial radiography and computed tomography. In addition, ongoing development on one of the beam lines is aimed at producing quasimonoenergetic photon beams of channeling

radiation and coherent bremsstrahlung

suitable for use in digital-subtraction

angiography.

• Radiation effects and processing. Current

applications include electron-beam treat- ment of waste water, curing of polymer composites, and radiation effects on electronics.

AVAILABILITY MIRF is available for collaborative research by researchers from industry, academia, and

other government agencies under the supervision ofNIST staff.

Contact:

Charles E. Dick

(301) 975-5580

email: charles.dick@nist.gov C229 Radiation Physics Building

ELECTRON

PARAMAGNETIC

RESONANCE FACILITY

NIST is leading a national and international

effort in electron paramagnetic resonance (EPR) dosimetry for measuring ionizing

radiation. Paramagnetic centers (molecules

or atoms with unpaired electrons) are pro- duced by the action of radiation on materials. In the EPR measurement, irradiated materials are placed in a magnetic field and

electron spin transitions are induced by an

electromagnetic field of the appropriate fre- quency (typically in the gigahertz range). EPR is used as a non-destructive probe of

the structure and concentration of paramagnetic centers. The centers created by ioniz- ing radiation are proportional to the absorbed dose and provide a sensitive and

versatile measurement method.

CAPABILITIES The EPR dosimetry facility is supported by

three state-of-the-art X-band EPR spectrometers capable of measuring radiation effects on a wide range of materials from inorganic semiconductors to biological tissues. The

data acquisition system provides full computer control of all spectrometer functions, including real-time spectral display and

rapid acquisition scan to analyze rapidly

decaying signals. The data acquisition sys- tem is interfaced with an advanced data

analysis station for data manipulation and

is capable of simulating and deconvoluting

multicomponent spectra.

APPLICATIONS EPR dosimetry is operable over many orders

of magnitude in absorbed dose (10" Gy to 10

5 Gy) and impacts many facets of society and industry:

• Radiation accident dosimetry. Using

biological tissues (bone, tooth enamel) or inanimate materials (clothing), retrospective dose assessment and mapping can be accomplished.

• Clinical radiology. Ionizing radiation doses administered in cancer therapy can be measured for external beam therapy using

dosimeters of crystalline alanine (an amino

acid) or validated for internally delivered bone-seeking radiopharmaceuticals using bone biopsies.

• Industrial radiation processing. Routine and transfer dosimetry for industrial radiation facilities can be performed using alanine dosimeters as well as post-irradiation

monitoring of radiation-processed meats,

shellfish, and fruits using bone, shell, or

seed.

The EPR facility also serves as a fully functional materials research facility for analyzing radiation effects on semiconductors,

optical fibers, functional polymers, and

composites.

AVAILABILITY The EPR facility is available for collaborative research by researchers from industry,

academia, and other government agencies under the supervision of NIST staff.

Contact: Marc F. Desrosiers (301) 975-5639

email: marc.desrosiers@nist.gov C229 Radiation Physics Building
PHYSICS LABORATORY

RADIOPHARMACEUTICAL

STANDARDIZATION

LABORATORY

Radioactivity measurements for diagnostic and therapeutic nuclear medicine in the United States are based on measurements at NIST. Activity measurements for the gammaray-emitting radionuclides are made using

4ttP liquid scintillation spectrometry and

4jiy ionization chamber. The calibration process also includes identification of radionuclide impurities by germanium

spectrometry. Recent development work has

focused on therapeutic nuclides for nuclear

medicine, radioimmunotherapy, and bone

palliation. Future work will focus on

intravascular brachytherapy and diagnostic

imaging.

CAPABILITIES The radiopharmaceutical standardization

laboratory provides calibration services for radionuclides and is available for technical

users who must make measurements consistent with national standards or who require

higher accuracy calibrations than are avail- able with commercial standards. NIST also undertakes basic research to develop new

methods of standardizing radionuclides for diagnostic and therapeutic applications. These studies include measurements of decay-scheme parameters, such as half lives and gamma-ray emission probabilities, and

identification of radionuclidic impurities.

AVAILABILITY The customer has no direct use of the facility. NIST staff can provide calibration services for any previously standardized

radionuclide. As part of the same program,

research associates of the Nuclear Energy

Institute produce standards that are certified

by NIST as Standard Reference Materials for

distribution to the radiopharmaceutical user communities.

Contact: Brian E. Zimmerman

(301) 975-5191

email: brian.zimmerman@nist.gov

CI 14 Radiation Physics Building

NEUTRON

INTERFEROMETER AND

OPTICS FACILITY

The Neutron Interferometer and Optics

Facility (NIOF) located at the NIST Center

for Neutron Research is one of the world's premier user facilities for neutron inter- ferometry and related neutron optical measurements. A neutron interferometer splits then recombines neutron waves. This gives

the interferometer its unique ability to ex- perimentally access the phase of neutron

waves. Phase measurements are used to study the magnetic, nuclear, and structural

properties of materials as well as fundamental questions in quantum physics. Related, innovative neutron optical techniques for use in condensed matter and materials sci- ence research are being developed.

CAPABILITIES Neutrons are extracted from a dual-crystal

parallel-tracking monochromator system, providing neutron energies in a range of 4 meV to 20 meV. Neutrons are counted with

integrating %e detectors or by highresolution position-sensitive detectors (with a resolution better than 50 (J.m). The sensitivity of the apparatus is enhanced greatly by state-of-the-art thermal, acoustical, and

vibration isolation systems. To reduce vibration, the NIOF is built on its own foundation, separate from the rest of the building.

The position of the interferometer is maintained to high precision by a computercontrolled servo system. The result is a

neutron interferometer facility with exceptional phase stability (5 x 10" 3 rad/day)and

fringe visibility (70 percent). The vibration

isolation is -7 g; the positional stability,

2 \im in translation and 1 (j.rad in rotation; and the temperature stability, 0.1 K/day.

APPLICATIONS Among the applications for the Neutron

Interferometer and Optics Facility are the

following:

• neutron phase contrast imaging,

• neutron tomography,

• neutron Fourier spectroscopy for surface

studies,

• determination of hydrogen content in materials,

• measurement of bound coherent scatter- ing lengths,

• small-angle neutron scattering studies with perfect crystals,

• tests and demonstrations of quantum

principles with matter waves,

• measurement of the neutron-electron

scattering length, and

• phase transition studies.

AVAILABILITY Beam time on the NIOF is available to qualified scientists from the United States and

abroad, subject to approval and scheduling

by the facility oversight committee.

Contact: Muhammad Arif (301) 975-6303

email: muhammad.arif@nist.gov

A 106 NIST Center for Neutron Research
PHYSICS LABORATORY

SERVICES

; is available at www.boulder.nist.gov/

, timefreq.

LOW-FREQUENCY BROADCAST

In 1956 low-frequency station WWVB

(Ft. Collins, Colo.) began broadcasting at 60 kHz. It offers several features:

• more predictable propagation (at 60 kHz)

than that ofWWVand WWVH,

• digital time code only,

• time and accuracy of 0.1 ms to 1 ms,

• frequency accuracy of 1 x 10" 11 for measurements over 1 day, and

• good reception in most areas of the conti- nental United States.

GOES TIME CODE SERVICE NIST time and frequency services are

relayed to most of the western hemisphere

by satellites positioned high above the equator. This service offers several features:

• cooperates with the National Oceanic and

Atmospheric Administration using two of

their GOES weather satellites,

• has an accuracy of 100 \is limited by

information on the location of the satellites,

• covers North and South America plus

major portions of the Atlantic and Pacific, and

• includes digital time code and continuously updated satellite locations.

AUTOMATED COMPUTER TIME SERVICE NIST also offers an Automated Computer

Time Service that uses commercial tele- phone lines to deliver a digital time code for computers and automated systems. The service includes the following:

• time accuracy of 1 ms to 100 ms depending on modem and mode used,

o • frequency accuracy of 1 x 10

0 for measurements over 1 day, and

• telephone-circuit delay measurement and

automated compensation for it.

For service call (303) 494-4774. Example

user software is available (specify RM8101 - Automated Computer Time Service) at

(301) 975-6776 orwww.bldrdoc.gov/

timefreq/service/acts.htm.

Contact:

D. Wayne Hanson

(303) 497-5233

email: hanson@boulder.nist.gov

Mailcode 847.40

Boulder, Colo. 80303-3328

TIME AND FREQUENCY

SERVICES

NIST disseminates time and frequency sig- nals by radio, satellite, telephone, and the

Internet. The time codes for each of these

services include advanced alert for changes

to and from daylight saving time and

advanced notice of insertion of leap seconds.

SHORT WAVE BROADCASTS

Since 1923 NIST radio station WWV (Fort

Collins, Colo.) has provided around-theclock shortwave broadcasts of time and fre- quency signals. A sister station, WWVH

(Kauai, Hawaii), was established in 1948 in Hawaii. The stations do the following:

• broadcast at 2.5, 5, 10, and 15 MHz; WWV

also broadcasts at 20 MHz;

• reliably cover continental United States and the Pacific at time accuracy of 1 ms to

10 ms; and

• have a frequency accuracy of 1 x 10"'.

Broadcasts include standard frequencies and

time intervals, time of day (both voice and

digital code), astronomical time corrections, and public service announcements (marine

weather, geophysical alerts, Omega and GPS

status information, and radio propagation

information).

Telephone access: (303) 499-7111 for WWV

and (808) 335-4363 for WWVH. Information
NIST provides a wide variety of services and programs to help U.S. industry

improve its international competitiveness, commercialize new technology, and achieve total quality in all facets of business operations.

Companies spanning nearly all industrial sectors depend on the precision and

reliability of NIST measurement services and products to keep their production

processes running smoothly, efficiently, and safely. NIST reference materials,

data, and calibrations help industry

maintain quality control in the production of everything from aerospace alloys

to voltmeters to breakfast cereals.

Responding to increased emphasis on

quality standards in international markets, NIST provides information and

assistance to about 20,000 organizations and individuals every year concerning

national and international voluntary

and regulatory product standards and

certification systems.

In addition, NIST offers a user-friendly

environment for businesses interested in cooperative research and development

efforts, NIST-developed technologies

available for license, guest researcher

opportunities, technical information, or technical assessments.

The most current information is available from our web site at http://

ts. nist.gov/ts. There you can find the latest information on normative standards, laboratory accreditation, and technology

transfer as well as catalogs of calibration

services, Standard Reference Databases, and Standard Reference Materials.

Contact:

Peter L.M. Heydemann, Director (301) 975-4500

email: peter.heydemann@nist.gov

fax: (301) 975-2183 306 NIST North

http://ts.nist.gov/ts

SERVICES AND PROGRAMS

164 Metric Program

165 Small Business Innovation Research Program

Standards Services

165 Office of Standards Services 165 Laboratory Accreditation Program

165 Technical Standards Activities Program

166 Global Standards Program

166 Standards Information Program 167 Standards Conformity Program

Technology Partnerships

167 Office of Technology Partnerships 167 Research and Technology Applications

Program

167 Industrial Partnerships Program

Measurement Services

168 Measurement Services 168 Standard Reference Data Program

168 Standard Reference Materials Program

168 Calibration Program

169 Weights and Measures Program

Information Services

169 Information Services

SERVICES

AND PROGRAMS

METRIC PROGRAM

The Metric Program seeks to accelerate the national transition to the metric system of measurement, the preferred system of weights and measures for U.S. trade and

commerce.

Implementing the 1988 amendments to the Metric Conversion Act of 1975, the Metric Program coordinates the metric transition

activities of all federal agencies.

Because of the metric system's importance

as an international standard, its use in product design, manufacturing, marketing, and

labeling is essential for U.S. industry's success in the global marketplace. The use of the metric system in federal agency pro- grams relating to trade, industry, and commerce is intended to support industry's

voluntary adoption of the metric system.

The program provides leadership and assis- tance on metric use and conversion to businesses, state and local governments,

standards organizations, trade associations, and the educational community.

Current Metric Program initiatives focus on

education and public awareness to gain broad-based support for national metrication from industry and the general public.

Under the banner "Toward a Metric America," a series of information and public awareness campaigns seeks to build partnerships to accelerate adoption of the metric system in trade and commerce; encourage

metric system use in all facets of education,

including the honing of worker skills; and
TECHNOLOGY SERVICES

create a more favorable environment for public acceptance of national metrication.

Visit our web site at www.nist.gov/metric.

Contact: Gerard C. Iannelli (301) 975-3690

email: metric_prg@nist.gov

fax: (301) 948-1416

306 NIST North

OFFICE OF STANDARDS

SERVICES

The Office of Standards Services (OSS) is the

focal point for the Commerce Department's

standards and conformity assessment activities. The office formulates and implements

standards-related policies and procedures to enhance domestic commerce and international trade. The office provides repre- sentation to domestic and international organizations and federal agencies concerned with standardization, product testing, certification, laboratory accreditation, and other forms of conformity assessment. It chairs the Interagency Committee on Standards Policy to implement the Office of Management and Budget Circular No. 119, "Federal Participation in the Development

and Use of Voluntary Standards," which is aimed at harmonizing standards and related programs of federal agencies. OSS also implements the National Technology Transfer and Advancement Act by coordinating

standards and conformity assessment activities of federal, state, and local government

agencies and with the private sector.

Contact: Belinda L. Collins (301) 975-4000

email: belinda.collins@nist.gov

fax: (301) 963-2871 282 NIST North

http ://ts . nist . gov/ts/htdocs/2 1 0 . h tm

LABORATORY

ACCREDITATION PROGRAM

The National Voluntary Laboratory Accreditation Program (NVLAP) provides thirdparty accreditation of testing and calibration

laboratories. Accreditation programs are

established in response to mandates or

administrative action by the federal government or requests from private-sector

organizations.

Accredited laboratories are listed in a published directory and at http://ts.nist.gov/ nvlap. NVLAP is in full conformance with

the standards of the International Organization for Standardization (ISO) and the International Electrotechnical Commission,

including ISO Guides 25 and 58. Accreditation provides confidence that a laboratory can provide the technical services claimed and has the quality system to maintain high

levels of proficiency.

NVLAP accredits laboratories in the follow- ing fields of testing: acoustics, asbestos fiber,

carpet, commercial products, computer

applications, construction products, electro- magnetic compatibility and telecommunications, energy efficient products, ionizing

radiation dosimetry, and thermal insulation. NVLAP also accredits laboratories in these calibration areas: dimensional,

electromagnetic-dc/low frequency, electro- magnetic-rf/microwave, ionizing radiation, mechanical, optical radiation, thermodynamics, and time and frequency.

Contact: James L. Cigler (301) 975-4016

email: NVLAP@nist.gov

fax: (301) 926-2884

282 NIST North

TECHNICAL STANDARDS

ACTIVITIES PROGRAM

The Technical Standards Activities Program

(TSAP) provides technical support for public- and private-sector standardization and

standards-related activities. TSAP manages

U.S. representation and participation in the International Organization of Legal Metrol- ogy (OIML). OIML is a treaty organization

of the international measurement community that promotes global trade through har- monization of performance requirements

(regulations) for measuring instruments used to ensure equity in commerce, ensure

public and worker health and safety, and

monitor environment protection.

SMALL BUSINESS

INNOVATION RESEARCH

PROGRAM

The Small Business Innovation Research Program provides funding on a competitive

basis to small high-tech businesses that can

carry out research on topics of interest identified by NIST's Measurement and Standards

Laboratories. Annually in October, NIST

issues a list of research and development

topics for which proposals are solicited. There are two phases of awards. In Phase I, awardees can receive up to $75,000 for a 6-month study to establish the technical

feasibility of a proposed project. Successful Phase I participants may compete in Phase

II for up to $300,000 to support further development of the work for a period not to exceed 2 years.

Contact: Norman H. Taylor

(301) 975-3085

email: norman.taylor@nist.gov

fax: (301) 548-0624 306 NIST North

http://ts.nist.gov/ts/htdocs/200/204/204.htm
TECHNOLOGY SERVICES

TSAP also manages technical support for domestic and international standardization

activities and coordination for U.S. standards advisers posted abroad. The program

serves as the Commerce Department's

(DOC's) technical contact point to investi- gate non-tariff trade barriers for nonagricultural products under the Agreement on Technical Barriers to Trade of the World

Trade Organization. It administers the DOC

Voluntary Standards Program, providing a mechanism for private-sector sponsors to develop standards in the public interest with

significant domestic and international trade impact. Current standards pertain to construction and industrial plywood, woodbased structural-use panels, and softwood lumber. The program provides the executive

secretariat for the Interagency Committee

on Standards Policy and coordinates NIST

participation in the annual U.S. observance

of World Standards Day.

Contact: Samuel E. Chappell

(301) 975-4029

email: samuel.chappell@nist.gov

fax: (301) 926-1559

164 NIST North

http://ts.nist.gov/ts/htdocs/210/215/215.htm

GLOBAL STANDARDS

PROGRAM

The Global Standards Program (GSP) provides technical information and support to

federal agencies and industry to assist them

in resolving trade issues related to standards and conformity assessment. GSP monitors

developments in standards and conformity

assessment activities in the Western Hemisphere, the European Union, Russia and the Newly Independent States (NIS), Central Europe, the Middle East, and the AsiaPacific Region. It supports programs of the Commerce Department's (DOC's) International Trade Administration, such as the Special American Business Intern Training

(SABIT) program for technical experts from

Russia and the NIS and conducts standards

related economic and policy analyses.

GSP staff participate in the activities of inter- agency groups to establish U.S. government

positions on standards-related aspects of major international agreements, such as the North American Free Trade Agreement. The

program also supports work in the Asia

Pacific Economic Cooperation and Free Trade Area of the Americas. Staff participate

in international and regional organizations

covering standards and conformity assess- ment, and also chair or participate in bilateral standards working groups.

GSP recruits and assigns standards experts

to posts at key U.S. embassies and missions. Standards experts are currently in place in Mexico City, Mexico; Buenos Aires, Argentina; Brussels, Belgium (U.S. Mission to the European Union); Riyadh, Saudi Arabia; and New Delhi, India. These experts work

with DOC commercial officers, other U.S. government agencies, U.S. business, and for- eign organizations to identify and remove

technical barriers to trade. GSP staff also organize and conduct workshops at NIST on

U.S. standards and conformity assessment

practices for foreign standards officials.

Contact: Mary H. Saunders

(301) 975-2396

email: ma17.saunders@nist.gov

fax: (301) 963-2871

282 NIST North

http://ts.nist.gov/gsp

STANDARDS INFORMATION

PROGRAM

The Standards Information Program (SIP) operates the National Center for Standards and Certification Information (NCSCI), a central repository for standards-related infor- mation in the United States. NCSCI provides

access to standards, technical regulations, and related documents published by U.S. and foreign governments as well as by

domestic, foreign, and international privatesector standards organizations. SIP responds

to domestic and foreign requests for infor- mation on U.S. standards, technical regulations, and conformity assessment procedures and to requests for information about for- eign standards and technical regulations

through its access to the network of information centers (ISONET) of the International Organization for Standardization.

SIP serves as the U.S. inquiry point under

the Agreement on Technical Barriers to Trade of the World Trade Organization

(WTO) to inform the WTO secretariat in Geneva of proposed U.S. government regulations that might affect trade, receives corre- sponding proposed foreign regulations, and

disseminates them to U.S. industry and cog- nizant government agencies. SIP operates

the U.S. North American Free Trade Agree- ment (NAFTA) inquiry point, which provides information about standards and-technical

regulations of the NAFTA countries. SIP also operates two telephone hotlines. One, (301) 921-4164, offers weekly updates on draft European standards and reports on draft standards of the European Committee for Standardization and the European Committee for Electrotechnical Standardization. The other, (301) 975-4041, offers weekly

updates on proposed foreign regulations for those concerned about regulations and

standards that might create technical

barriers to trade.

Contact: JoAnne R. Overman

(301) 975-4037

email: ncsci@nist.gov

fax: (301) 926-1559

164 NIST North

http://ts.nist.gov/ts/htdocs/210/217/217.htm
TECHNOLOGY SERVICES

1

STANDARDS

CONFORMITY PROGRAM

The Standards Conformity Program (SCP) has responsibilities under the Fastener Quality Act (FQA) (Public Law 101-592 as amended by Public Law 104-113), and the National Technology Transfer and Advance- ment Act (NTTAA). The SCP also provides

operational support for the National Voluntary Conformity Assessment Systems Evaluation (NVCASE) program.

SCP issues final implementing regulations

for the FQA; approves laboratory accreditation bodies to accredit fastener testing laboratories under the act and its implementing

regulations; and provides technical advice and assistance to the Bureau of Export

Administration, which is responsible for enforcement, and to the Patent and Trade- mark Office, which is responsible for record- ing insignia. For more information on the Fastener Quality Act, see www.nist.gov/fqa.

Under the NTTAA, SCP coordinates conformity assessment activities of federal, state, and

local government agencies and with the private sector, aiming to eliminate unnecessary

duplication and complexity in the develop- ment and promulgation of conformity

requirements.

The NVCASE program recognizes competent

accreditors of laboratories, certifiers, or registrars of quality assessors in order to provide assurances to other governments

regarding the conformity of U.S. products

that are exported to regulated markets in

their countries.

Contact: Subhas G. Malghan

(301) 975-5120

email: subhas.malghan@nist.gov

fax: (301) 975-2183

306 NIST North

http://ts.nist.gov/ts/htdocs/210/218/218.htm

OFFICE OF TECHNOLOGY

PARTNERSHIPS

The primary objective of the Office of Technology Partnerships (OTP) is to build and

sustain technology partnering activities between the NIST laboratories and its mission-related organizations. OTP does so by managing various technology transfer programs; managing NIST's intellectual

property; carrying out assigned technology

transfer functions under the Stevenson- Wydler Technology Innovation Act of 1980 and the Federal Technology Transfer

Act of 1986; performing industrial and

intergovernmental liaison; and strengthening NIST-wide awareness of technology

transfer options and their implications. The

office assists NIST leadership in reviewing

related policies and practices and in helping

to propagate improvements in research and

development relationships throughout NIST.

Contact: Jack Williams

(301) 975-3850

email: jack.williams@nist.gov

fax: (301) 869-2751

213 NIST North

http://ts.nist.gov/ts/htdocs/220.htm

RESEARCH AND

TECHNOLOGY APPLICATIONS

PROGRAM

The Research and Technology Applications

Program is located at the NIST laboratories

in Boulder, Colo., and provides information on NIST activities and services to industry,

academia, and state and local governments

in the western region.

Contact: Bruce E. Mattson

(301) 975-3084

email: bruce.mattson@nist.gov

fax: (301) 869-2751 213 NIST North

http://ts.nist.gov/ts/htdocs/220/221/221.htm

INDUSTRIAL PARTNERSHIPS

PROGRAM

The Industrial Partnerships Program provides assistance in several areas:

• working with NIST research and develop- ment (R&D) programs;

• joint R&D relationships;

• cooperative R&D agreements (CRADAs);

• domestic (U.S.) guest researchers;

• industry fellow agreements;

• NIST R&D relationship policies;

• use of NIST facilities;

• intellectual property issues;

• patents;

• licenses;

• non-disclosure arrangements; and

• commercializing NIST technologies.

Contact: Bruce E. Mattson

(301) 975-3084

email: IPP@nist.gov

fax: (301) 869-2751

213 NIST North

http://ts.nist.gov/ts/htdocs/220/222/222.htm
158 TECHNOLOGY SERVICES

MEASUREMENT SERVICES

The four components of measurement services—data, materials, calibrations, and

weights and measures—provide U.S. tech- nologists with access to the U.S. national standards of measurement. Uniform and

accurate measurements order the marketplace and reduce risk and cost to buyers and

sellers. Connection to a solid measurement

foundation is essential to industry in attain- ing quality and performance goals, demonstrating standards conformity, and

removing non-tariff trade barriers. The busi- ness of America is business, and the competitive forces within business drive the need for increased use and accuracy of measurement. NIST measurement services meet

these needs at the point of measurement us- age by delivering services directly to about

10,000 companies. A current emphasis of the program is to expand service delivery via accredited, NIST-traceable intermediate

service providers.

Contact:

Peter L.M. Heydemann

(301) 975-4500

email: peter.heydemann@nist.gov

fax: (301)975-2183

306 NIST North

http://ts.nist.gov/ts/htdocs/230.htm

STANDARD REFERENCE

DATA PROGRAM

For critical technical decisions, engineers and scientists in industrial and academic

research rely on the NIST Standard Refer- ence Data Program (SRDP). For 30 years, SRDP has provided well-documented numeric data to scientists and engineers for use in technical problem solving, research, and development. These recommended val- ues are based on data that have been

extracted from the world's literature, assessed for reliability, and then evaluated

for the preferred values. These data activities are conducted by scientists at NIST and

other institutions.

The NIST Standard Reference Database

series has grown to over 50 electronic data- bases in chemistry, physics, materials, build- ing and fire research, software recognition, and electronics. Versatile interactive databases provide easy access to NIST highquality data. Many databases are now avail- able via the World Wide Web. The catalog of data products distributed by the NIST Standard Reference Data Program is available at www.nist.gov/srd. To receive a printed copy

of the catalog, contact Joan Sauerwein at (301) 975-2208.

Contact: John Rumble, Jr. (301) 975-2200

email: srdata@nist.gov

fax: (301) 926-0416

113 NIST North

www.nist.gov/srd

STANDARD REFERENCE

MATERIALS PROGRAM

The Standard Reference Materials Program

has pioneered and continues to be the leader

in the development of certified reference materials for quality assurance of measurements. Through the Standard Reference

Materials Program, NIST provides more

than 1,300 different Standard Reference

Materials (SRM®) that are certified for their

specific chemical or physical properties. SRMs are used for three main purposes: to help develop accurate methods of analysis (reference methods); to calibrate measure- ment systems; and to ensure the long-term

adequacy and integrity of measurement

quality assurance programs. NIST SRMs

also legally constitute part of the National Measurement System infrastructure of the United States and, as such, are essential

transfer mechanisms for national (and inter- national) measurement traceability. The

SRM Program provides a series of publications, known as the SP260 series, that is

available to assist users in the application of SRMs. A complete listing of the SP260 series, the Standard Reference Materials Catalog,

price list, brochures, newsletters, needs assessment forms, and feedback cards are available at http://ts.nist.gov/srm. Some of these publications give practical guidance

for using the SRMs while others give additional information about the certification process of particular SRMs. Of special note is SP 260-100, Standard Reference Materials Handbook: Handbookfor SRM Users, by

J.K. Taylor, which was written to discuss general concepts of precision and accuracy as applied to SRMs and their impact on quality assurance and the measurement process.

Contact: Thomas E. Gills (301) 975-2015

email: srminfo@nist.gov

fax: (301) 926-4342

112 Engineering Mechanics Building

CALIBRATION PROGRAM

NIST calibration services link the makers and users of precision instruments to the

basic and derived units of the International System (SI) of measurements. As one of the cornerstones for ensuring the consistency of measurements in the United States and

internationally, this measurement transfer system is a critical factor in controlling

manufacturing, assembly processes, and

marketing as well as assuring the quality of manufactured goods. Users of these services send transfer standards to NIST where they

are calibrated according to a measurement

process that is stable, predictable, and statistically controlled. Currently, NIST provides more than 500 different calibrations, special

tests, and measurement assurance programs

in seven major measurement areas.

The Calibration Program distributes selected publications of general interest, including

the Calibration Services Users Guide

(SP 250), describing the calibration services
TECHNOLOGY SERVICES

NIST provides; the Calibration Fee Schedule (SP 250 appendix); Guidelinesfor Evaluating and Expressing the Uncertainty ofNISTMeasurement Results (TN 1297); Guidefor the Use ofthe Inter- national System of Units (SP 811); and

Experimentation and Measurement

(SP 672). To request these publications, fax your name and address to the number

below.

Contact:

Sharrill Dittmann

(301) 975-2002

email: calibrations@nist.gov

fax: (301) 869-3548

236 NIST North

http://ts.nist.gov/calibrations

WEIGHTS AND MEASURES

PROGRAM

The Weights and Measures Program pro- motes uniformity among the states in weights and measures standards, laws, and

practices to facilitate trade and protect U.S. businesses and citizens. It is estimated that

these laws and regulations impact U.S. sales

of products or services totaling over $4.13

trillion annually. The program is known outside of NIST as the Office of Weights and

Measures (OWM), a name that dates back to 1837 when the program was established. OWM sponsors the National Conference on

Weights and Measures (NCWM), an organization of state weights and measures officials and representatives of industry, consumers, and federal agencies. NCWM

develops uniform laws, regulations, and

methods of practice that are published by NIST (www.nist.gov/ncwm). When these standards are adopted by regulatory agencies, they become mandatory. OWM administers the State Laboratory Program, which

provides the basis for ensuring traceability

of state weights and measures standards to NIST; the National Type Evaluation Pro- gram, which evaluates models of commercial weighing and measuring equipment to determine compliance with NIST Handbook

44; and the NCWM/NIST Training Program

for weights and measures officials and state and industry metrologists.

Contact:

Gilbert M. Ugiansky

(301) 975-4004

email: owm@nist.gov

fax: (301) 926-0647

223 NIST North www.nist.gov/owm

INFORMATION SERVICES

The Office of Information Services (OIS) maintains a comprehensive, international

collection of information in scientific disciplines such as metrology, mathematics,

physical sciences, computer science, and

materials science. OIS staff serve the technical information needs of NIST scientists and

engineers and communicate the results of NIST research to scientific and engineering

communities worldwide.

OIS programs include selecting, acquiring,

organizing, and disseminating primarily scientific and technical information in print and electronic forms. The NIST Research

Library, with its specialized collection of approximately 200,000 volumes, including

subscriptions to approximately 1,500 journals, microform collections, and electronic

databases available on CD-ROMs or through

online services, serves the entire NIST scientific and research community.

OIS can be reached on the Internet through

the NIST Virtual Library (http://

nvl.nist.gov), a resource that features a

selection of information resources available

at the library, as well as pointers to other

related information resources available through the Internet, including the World Wide Web.

To obtain further information about the NIST Research Library and the specialized

reference services, online search services, and available databases, contact library ref- erence staff at (301) 975-3052 or email:

reflib@nist.gov.

Contact: Paul Vassallo (301) 975-2786

email: paul.vassallo@nist.gov

fax: (301) 869-8071 E106 Administration Building

http://nvl.nist.gov
INDEXES

FACILITIES INDEX

Acoustic Anechoic Chamber

Facility, 125 Advanced Insulation Facility, 50 Advanced Network Facility, 108

Calibrated Hot Box, 49

Center for Theoretical and

Computational Materials Science, 140 Computer and Network Security

Facility, 108

Concentric Loop Antenna Systems, 96

Controlled Background Radiometric

Facility, 160 Electromagnetic Anechoic Chamber, 96

Electron Paramagnetic Resonance

Facility, 161 Fluid Flow Measurement and

Research Facilities, 75 Ground Screen Antenna Range, 95 High-Resolution UV and Optical Spectroscopy Facility, 159

Integrated-Circuit Fabrication

Laboratory, 97

Large-Scale Structures Testing

Facility, 48

Large Environmental Chamber,* 48

Line Heat-Source Guarded

Hot Plate, 49

Liquid-Nitrogen Flow

Measurements,* 75 Low-Background Infrared Radiation

Facility, 160 Magnetic Thin-Film Fabrication and

Imaging Facility, 98 Magnetic Microstructure Measurement Facility, 159 Magnetic Engineering Research

Facility, 141 Mass Standards Facility, 125

Materials Science X-ray Beamlines,

140

Medical-Industrial Radiation

Facility, 160 Mobile Transient Reception/ Transmission System, 97

Mode-Stirred Chambers, 95 Molecular-Beam Epitaxy Facility, 94

National Advanced Manufacturing

Testbed, 124

Near-Field Scanning Facility for Antenna Measurements, 98

Neutron Interferometer and Optics

Facility, 162

NIST Center for Neutron Research,* 136 Powder Characterization and

Processing Laboratory, 142 Radiopharmaceutical

Standardization Laboratory, 162 Semiconductor Processing

Laboratory, 93 Small-Angle X-ray Scattering

Facility,* 142 Standard Transient/Impulsive Field

Facility, 97

Synchrotron Ultraviolet Radiation

Facility III, 159

Transverse Electromagnetic Cell, 95

Tri-Directional Test Facility, 48

Llltralow-Temperature Electronics

Facility, 97 Wafer Probing Laboratory, 94

SUBJECT INDEX A

AASHTO, Materials Reference

Laboratory, 42

absolute cryogenic radiometer, 88, 160

ac

signals, generation of, 79

waveforms, 79, 87

accreditation

laboratories, testing and

calibration, 1 65 Program, National Voluntary

Laboratory, 165

ac-dc thermal conversion measurements,

88

voltage and current measurements,

advanced, 79, 87

acoustic(s) anechoic chamber, facility, 125

emission

techniques, 116 waveform-based, 135 measurements

services, 125 temperature scale, 63

research, 115

resonators, 63

technology, flow measurements, 54

waveguides, 63

adaptive learning systems, ATP focused program, 8

additives, compatibilizers, and

fillers, 134

adhesion, interfacial, 135

adsorbents fundamental and applied properties

of, 62

adsorption isotherm measurements,

gases, 69 advanced

ceramics, precision machining

research, 113 image display systems, 81

insulation facility, 50 manufacturing

Systems and Networking Testbed, 120

Testbed, National, 112, 118, 124

materials

precision machining research, 113 Program, 127

technologies, ATP projects, 21, 22 Network Technologies, division, 101

optical systems, 113

Processing Programs, division, 13

Technology Program

focused program descriptions, 8

overview, 6 programs and competitions, 8

project listing, 13

project sampler, 7 Proposal Preparation Kit, 12 proposing a focused program, 10 Welding Manufacturing System, 118

aerospace alloys, casting, 133, 134 agreement(s)

cooperative research and

development, 35, 105, 167

facility use, 38

guest researcher, 35

airconditioning, dynamic system, 44

quality and ventilation, 43

algorithm(s) automation, reliability, 78 computational geometry, 106 image compression, 105

large-scale optimization, 104 mass spectral database, 66 mathematical and statistical problems, 104 numerical, high-performance

computers, 103

signal processing, 58

statistical and neural network, 103

theoretical, 150

analytical Chemistry, division, 69

infometrics, 73

analytical {cont.) mass spectrometry for organics and

biomolecules, 70 measurements, focusing cold neutrons for, 74

separation science methodology, 71 annealed fiber coil technology,

stable current sensors, 92

annealing, semiconductor wafers, 93 antenna

accuracy, 36

calibrations, 95, 96

characteristics, 98

diagnostics, 98 measurements, 87, 98

patterns, 95 Range, Ground-Screen, 95

systems, concentric loop, 96 API thread gauges, measurement, 110 appearance measurements for coated objects, 41 metrology, 42

application experts, enhancing

capabilities of, ATP projects, 13 applied computational chemistry, 56 Economics, division, 47

architecture computer, 107

control, 113, 116

description languages, 119

reference model, manufacturing, 117

system, 103

artificial intelligence, selection of materials, 41

aspheres, measuring figure error, 113

assembly, materials measurements, 128 ATM (asynchronous transfer mode)

network simulation and

modeling, 101 network, testbed, 108

product interoperability and

standards conformance testing, 10 atmosphere

chemistry studies high-resolution measurements, 157

use of laser pulses, 154 measurements, ambient, 72

research, 6l

spectral studies, 153 thermodynamic data, 64

see also environment(al), ozone

layer atom(s)

cold, trapped, 150

highly ionized, research on, 149

^Available for proprietary research
INDEXES 171

atom (s) {cont.)

interferometry, 149

laser cooling and trapping of, 149 atomic beam frequency standards, 156

clocks, next generation, 150

data, neutral atoms and ions, 1 59

-force microscope, calibrated, 110

Physics, division, 148

processes, fundamental, 6l

-scale measuring machine, 110

spectra, measurement, 149

spectrometry, 69, 70

spectroscopy, fundamental studies, 69

structure, 150

total energies, results, 147

atomization of steel, 133 automated

approaches; instrument control.

drift, and interference

corrections, 70

chemical analysis systems, 73 Computer Time Service, 1 63

conversion of machine-printed documents to electronic form, 103

data entry from handprinted form

images, 103

design and manufacturing systems, manipulating dynamic objects, 106

fingerprint classification, 103

generation of tests for specifications, formal methods, 99, 100 methods for mechanism generation,

analysis, and reduction, 57 Production Technology, division, 113 sample preparation and sensing, 73 sample treatments, 70

welding, 118 automatic speech recognition technology, 102 automation

construction, 41, 44

electronic design, 81

laboratory technology and

standards, 73 automotive

AutoStep, pilot project, 122

Composites Consortium, 135 manufacturing monitoring and

control technologies, ATP project, 12 measurements and standards, 36

parts, liquid composite molding, 135 product design, SIMA, 120

see also vehicle

award, Malcolm Baldrige National

Quality, 33

BACnet

Interoperability Testing Consortium, 37

standard, 36

Baldrige National Quality Program, 33

ballistic imaging systems, 106

barriers, trade, 166 beam stations, NSLS, 140 benchmark reference data, 147

bidirectional characterization,

optical scatter, 154

biocatalyst development,

industrial, 52 biomaterials macromolecular structure, 52 measurement methods, 52 biomimetic materials, 53 biomolecular materials, 53 biomolecules

analytical mass spectrometry, 70

characterization and control, 53 determination of, 71 markers for health status, 70

bioprocess engineering measurements, 52

bioreactor, desktop, ATP project, 7 biosensors automated sample preparation, 73 biomimetic surfaces, 53

bioseparations, preparative, 53 biotechnology

applications, 53 ATP projects, 20

Center for Advanced Research

in, 52, 53

division, 52

health-related, ATP projects, 20

industrial and agricultural, ATP projects, 21 blackbody and band-limited IR radiation, 88

cryogenic, 153, 160

heat-pipe, 152

large-area, development, 152

sources, 160 bone palliation, 162

Bose-Einstein condensates, 150, 158 bound coherent scattering lengths, measurement, 1 62

brachytherapy, intravascular, 1 62 breadboard heat pump, refrigerants and refrigeration cycles, 43

bridges and other large structures, technologies for, ATP projects, 18

brittle materials, mechanical

properties, 129 broadband

integrated services digital network, 101 probes and sensors, calibration, 97

budget, 4

building(s) and Fire Research

databases, 168

Laboratory, 40

codes and standards, 40

control BACnet, consortia, 37

systems, 36, 44 Environment, division, 43

heat transfer, 43

indoor air quality and ventilation, 43

Materials, division, 41

see also construction

c

calibration and Research Laboratory, Large-Scale Metrology, 112

laboratories, 165 Measurement Services, 168

methodologies, coordinate measuring machine, 111 Program, 168

services, 168

calorimetry, low-temperature heat

capacity, facility, 64 camera, thermal imaging, 152 cancer therapy, clinical radiology, 1 6

candela, detector-based, 151 capacitance, fundamental standard, 88

capillary, electrophoresis automated sample preparation methods, 73 DNA detection, 52 mass spectrometry, 70

trace-level determination, 71 carotenoids in food and serum, 71

catalysts, NCNR studies, 139

catalysis and biocatalysis technologies, ATP focused program, 9, 17 cement and concrete Reference Laboratory (CCRL), 42

research, 41 Center for Advanced Research in Biotechnology (CARB), 52, 53

ceramic(s) advanced Powder Characterization and

Processing Laboratory, 142

precision machining research, 113 ATP projects, 24

coatings, 127

databases ceramic machinability, 128 Phase Diagrams for Ceramists, 128

Structural Ceramics, 128

division, 126

functional, 131 machining

Consortium, 37, 131 program, 131 mechanical properties, 129 phase equilibria diagrams, }b

powders, nanometer-scale, 7 processing

Characterization Consortium, 38, 132

research, 36, 132

certification conformity assessment activities, 165

information, 166 chemical

analysis NIST Center for Neutron

Research, 138, 139

with neutron beams, 74

equilibrium constants, 64

kinetics, 57, 64 measurements, improving

quality of, 61 microsensors, solid-state, 57 modeling, drug design and, ATP projects, 20

radicals, fundamental atomic and

molecular processes, 6l

reactions dynamics, 154

pressure-dependent, 65

Science and Technology

Laboratory, 51 thermodynamics, 64

vapor deposition materials processing, 55

reactions, 65 semiconductor processing, 94

chemistry and chemical engineering, ATP projects, 20 and Life Sciences Office, ATP, 17 ATP projects, 20 computational

applied, 56 program, 64

databases, 168

electroanalytical, 72
INDEXES

chemistry (cont.)

in thermal reactors, flow and, 56

of materials processing, 55 WebBook, 65 chemometrics research, 6l chlorofluorocarbon research, 36, 66 chromatographic retention indices, analysis of natural gas, 62 chromatography and electromigration techniques, 70

capillary, 71

gas, 71, 72

liquid, 70, 71

supercritical fluid, 71

clays, properties, 67

clocks atomic

next generation, 150

NIST-7, 156 high-performance, noise

processes, 157

synchronized, hardware, 107

closed-loop

control, 56 manufacturing program, 113

coatings appearance measurements, 41 ceramic, 127 diamond deposition and multilayer

materials, AT projects, 22

electrodeposited, evaluation of methods used to optimize

properties, 134 modeling appearance of, 42

organic, 42

Service Life Prediction Consortium, 37, 42

steel, 41 coldatoms, laser cooling and

trapping, 149 neutrons

analytical measurements, 74

depth profiling, 138 prompt-gamma-ray activation

analysis, 138

reflectometer with polarized beam option, 137

source and guide hall, 136

trapping of polarized, 105

collaborative research, 3, 35

collision -induced dissociation, analytical problems, 70 phenomena, ultracold neutral atom

traps, 150

colloidal mixtures, NCNR studies, 139

solutions, dynamics, 68

suspensions, studies, 67, 143 combustion

chemical kinetic mechanisms, 57

chemistry, use of laser pulses, 154

data, measurement technology for benchmark spray, 54

polymer, research of, 3, 47

turbulent, models, 106 commerce

domestic, 165

electronic

in scientific and engineering

data, 145

of component information, 81

of printed circuit assembly

services, 82

of technical information, 44 STEP, 122 commercialization, NIST

technologies, 39, 167 Common-Criteria-based testing program, 101 complex

coupling, high-temperature reacting

flows, 57 Form Metrology Laboratory, 110

reactions, 65 component-based software, ATP

focused program, 8, 13 composite(s)

particles with enhanced magnetic and structural properties, growth, 55 polymer, 134

structures, manufacturing, ATP

focused program, 9, 18 compositional mapping, 61, 74

compression, image, 104 computational

algorithms, near-field optics, 150

chemistry, 64

fluid dynamics

capabilities, 75

large eddy simulation techniques, 45 metering research, 54

geometry, 104

materials research, 140 metrology of manufactured parts, 1 1

computer(s)

-aided design semiconductor devices and

packages, 84

software, 121 STEP standard, 122

computer(s) (cont.) -aided Manufacturing Engineering Consortium (CAME), 37, 121

assisted tomography, 148 emergency response team, 108

graphics, techniques, 103

-integrated construction, 44 knowledge system, construction

materials and systems, 42 manufacturing, standards development, 120

massively parallel processing, 150 modern architecture, performance,

107 network security, statistical process

control paradigm, 105

security

division, 100

technology, 100, 101, 108

simulation

air and contaminant transport, 43

formation dynamics and

structure of gels, 67 measurement process, 111 thermodynamic and transport

properties of fluids, 67

virus laboratory, 108 computing

and communications, high- performance

information storage and

interconnect systems, 107

Systems Integration for Manufacturing Applications, 120

parallel, 107

scientific, 106

concrete frame structures, strengthening methodologies, 41 high-performance, 41, 42 condensed matter, 147 conformance testing information technology, 100 STEP project, 123 conformity assessment

activities, 165, 1 66, 167 Systems Evaluation, National Voluntary (NVCASE), 167 consortium

Automotive Composites, 135 BACnet Interoperability Testing, 37 Ceramic Machining, 37, 131 Ceramic Processing

Characterization, 38, 132 Coatings Service Life Prediction, 37, 42

consortium (cont.) Computer-Aided Manufacturing

Engineering, 37, 121 Enhanced Machine Controller, 37

electronic solders, 134 Environmentally Friendly New Flame

Retardants, 37 Flowmeter Installation Effects, 37 Machine Tool Performance Models and Machine Data Repository, 38

Monolithic Microwave Integrated

Circuits, 37, 86

National Industrial Information

Infrastructure Protocols, 122

National Storage Industry, 141 NIST-EPRI Ultrasonic Flow Meter

Testing Program, 37 North American Integrated Services

Digital Network Users' Forum, 37

Optical Properties of Materials, 37 Orthopedic Accelerated Wear

Resistance, 37 PlantSTEP, Inc., 44, 120

constant(s)

elastic, resonance spectra, 135

fine-structure, determination of, 88

fundamental, data center, 145

optical, multilayer materials, 146

physical, redetermining, 72

rate, estimation of, 57, 65

constraint representation, design

tools, 121 construction computer-integrated, 44

Materials and Systems Program (CONMAT), High-Performance, 41,42

Materials Reference Laboratories (CMRL),42

seismic standards, 40

see also building(s) contaminant(s)

environmental, 71

gases measuring in ultrapure materials, 72 measuring partial pressure of, 59

particle formation, detection, 56

nucleation, simulation, 57

transport in buildings, 43

contract(s), research and

development, 35

controller(s) enhanced machine, 37, 116, 119

real-time, software engineering, 119

cooperative research and

development agreements

assistance, 167
INDEXES 173

cooperative research and

development agreements (cont.)

joint research efforts, 35

statistical engineering, 105

coordinate measuring machines,

instruments, and systems

calibration methodologies, 1 1

large-scale, standardization, artifact development, and calibration, 112

laser tracker, 112 measurement traceability, 36, 105

metrology, 1 1

temperature- and humiditycontrolled environment, 110

tolerance standards, 120

corrosion

detection and characterization, 55 Performance Database, NACE/NIST,

128

resistance of rapidly solidified nitrogenated steels, 134

coulometry, high-accuracy, 72

coupling coefficients of the weak

interaction, 155

cryocooler(s), research and

development, 68

cryoelectronics, nanoscale devices, 88

cryogenic(s) current comparator

calibrating resistors, 78

precision electrical measurements, 7 flow measurement devices,

calibration, 75

radiometry, 91. 152

temperatures, 68

cryptographic security, technology and standards, 100, 101

crystal components, subsurface damage in

single-, 114 Data Center, 128

diffraction techniques, 151

growth, mathematical modeling, 103

properties, 129

shapes, modeling three-dimensional, 141

structures, studies, 139

crystallography

analysis, 136

X-ray, 53

current measurements,

advanced, 78, 79

D

data

Center, Fundamental Constants, 145

chemical, 65

crystallography, 128

data {cont.)

dictionaries, online, 81 Encryption Standard, 101 estimation computational chemistry, 56 thermochemical and kinetic, 57 exchange, 120

fire, 45

for electronic structure calculations, 147 machine-tool performance, 114 manufacturing, 121, 123

materials

characterization, 86

evaluated, 128 Measurement Services, 168

metals, 133

optical, storage, 92 polymer characterization, 130

process, 124

product, 81, 122, 145 Program, Standard Reference, 168

repository, 114

scientific and engineering, electronic commerce in, 145

sets, web service, 105

spectral, 153

spray combustion, 54

storage

digital, ATP focused program, 8, 13 ultrahigh density, 141 thermochemistry, Si-O-H and

Si-P-H, 57 thermodynamic, 64

time-series, statistical analysis of, 157

database(s) adsorption isotherm measurements,

69 ceramic machinability, 128

fire data management, 45 hexapod metrology, 112 high-Tc superconductivity, 128

indoor air quality performance, 43 NACE/NIST Corrosion Performance,

128 NIST/EPA/NIH Mass Spectral, 66 NIST Research Library, 169

optical constants, high-accuracy, 83

over computer networks, dissemination of, 145 Phase Diagrams for Ceramists, 128

Physics Laboratory, 145

software errors, faults, and

failures, 99

Standard Reference Data

Program, 128, 168

structural ceramics, 128 thermochemical and kinetic

properties, 65

daylight saving time, advanced

alert, 163 deadweight standards, 115 decay-scheme parameters, measurements, 162 degradation chemical and physical mechanisms,

135

electric power, sources and presence, 80 mechanisms and methods, 41

dental and medical materials, 127

ceramics, abrasive finishing and

wear, 131 design advanced, chemical measurements,

61 automation, electronic, 81

research, engineering, 121

detector(s) characterizations, 91

fire protection, 45, 46

infrared characterizing, 153

long wavelength, 88

metrology, spectral radiometry, 152

photodiode, for radiometry, 146

technologies, characterizing appearance, 42

X-ray, 97

diagnostic(s) DNA, tools for, ATP focused program,

9, 19

for process control, online, 56 imaging, 162 low-temperature discharges, 80

predicting failure of electrical insulating materials, 80

software, 99

dielectric(s) materials and devices, 93

reliability, metrology, 84

research, 80

thin-film, 83

diffractometer

for residual stress, texture, and

single-crystal (DARTS) studies, 136 high-performance, multiaxis, 150 neutron powder, high-resolution, 136

diffusion, oxidation, and annealing, 93

digital data storage, ATP focused program,

8, 13

display interfaces, 107

Library of Mathematical Functions, 104

digital (cont.) signature

fingerprint biometrics, 36

standard, 101

video

in information networks, ATP

focused program, 8, 14

Interoperability Testbed, 108 supercomputer, 81 technology development, 101

tools and management capabilities, ATP projects, 14

dilute-solution thermodynamics, 68 dimensional measurement

capabilities, 110

coordinate measuring systems, 120

traceability, complex forms, 110

diode

high-frequency, capabilities, 88

lasers frequency-stabilized, 159 high-performance, 157 semiconductor devices, 93

disabilities aids, 117

disaster response planning, 46

discharges low-current dc Townsend, 80

low-temperature, 80

radio-frequency, 80

dispersion and rheology, ceramic processing, 132

standards, 91

display(s) and graphic image manipulation, ATP projects, 16

flat-panel, metrology for, 81

information, light measurements,

151

quality, issues, 81

systems, advanced image, 81 technology systems, advanced, 107 DNA

chemistry, 52

diagnostics, tools for, ATP focused program, 9, 19

profiling, 52 sequencing technology, ATP project, 7 document conversion, automated,

103 domain-engineered geometries, bulk and thin-film ferroelectric

materials, 93

dopant(s) concentration profiles, evaluation, 93

profiles, two-dimensional, 83
174 INDEXES

dosimetry

chemical, 155

electron paramagnetic resonance,

161 medical, l6l

neutron, 156 NIST Center for Neutron Research, 139

radiation accident, 1 6

drug(s) design and chemical modeling, ATP projects, 20

of abuse in urine and hair, 71

drying, mechanism, 132

durability of construction materials and systems, 42

earthquake

engineering, National Earthquake

Hazards Reduction Program, 40, 48

simulation, Large-Scale Structures Testing Facility, 48

system to predict spread of fires, 45

see also seismic economic(s)

Applied, office, 47

Assessment Office, ATP, 12 software tools for evaluating cost

effectiveness of capital investments, 47

electrical characterization of plasma

parameters, 56

discharges, production of toxic byproducts, 80

insulators, dielectrics used as, 80

interconnect reliability, integrated

circuits, 84 power systems

dielectrics used as electrical

insulators, 80

metrology, 80

precision measurements,

high-temperature superconductors, 78

properties of materials, non-invasive

evaluation, 97

substitution, measurements, 152

systems, reliability and safety, 80

transport measurements of superconductors, 89

Electricity, division, 77

electroanalytical chemistry,

inorganic, 72

electrodeposition techniques, metals

processing, 133

electromagnetic

characterization of materials, 86

emission, radiated, 95

fields

division, 85

generation, 96 immunity measurements, 95

interference and compatibility, 87

noise, effects, 79

probes and sensors, evaluating impulse response, 97

Technology, division, 87

waves, mathematical modeling, 103

electromigration and stress voidage, 128

reliability testing of magnetoresistive heads, 105

techniques, 70

electron(s)

accelerator, 160 and Optical Physics, division, 146 attachment cross sections for etching

gases, 80 beam ion trap, 149

density of states in solids, 159

in solids, interactions, 147 Paramagnetic Resonance

Facility, 1 6

spin-dependent contrast measurements in STM, 146

transfer processes, intra- and

inter-protein, 52

electronic(s) and Electrical Engineering

Laboratory, 76 and electrical systems, new

materials/manufacturing, ATP

projects, 17 and optical systems, noise in, 157 ATP projects, 16, 17 commerce

in scientific and engineering data, 145

of component information, 81

of printed circuit assembly

services, 82

of technical information, 44

STEP, 122 component representations, objectoriented, 82

databases, 168

design automation, 81

Integrated Infrastructure for, 81 handbook, engineering problems and software applications, 120 information technology and, ATP, 8 Manufacturing, Integrated

Infrastructure for, 82

electronic(s) (cont.) marketplace, 145 packaging, interconnection and

assembly, 128

product data, exchange, 81

structure calculations, data for, 147

in matter, 150

systems, testing, 79

electrostatic discharges, measurement

of fields radiated from, 97

elemental

analysis, 74

isotopic metrology, inorganic and, 6'

ellipsometry, multiple wavelength, 94

energy conservation, buildings, 36,

43, 47, 48, 49

engineering

design research, 121 measurements for near- and

supercritical processes, 55

ontologies, design tools, 121 enhanced machine controller, 37,

116, 119

enthalpy

of adsorption chlorinated trace constituents of natural gas, 62

clay and carbon adsorbents, 62

of combustion, 64

of formation, 64

environment(al)

atmospheric and chemometric

research, 61

building, 43 chamber, large, 48

contaminants, 71 exposure of building materials, 42

Friendly New Flame Retardants Consortium, 37 impact of gaseous dielectrics, 80

trace gases, 72

virtual, 119

see also atmosphere, ozone layer enzyme(s)

-catalyzed reaction project, biothermodynamics, 52

characterization, 53

designer, 52

epitaxial growth, nanometer-scale

science, 146

epitaxy, kinetic-energy-enhanced, microscopic basis, 158

error(s) analysis techniques, 113

correction codes, image

compression, 105

sources, coordinate measuring

machines, 111

etching, semiconductor processing, 94

evaluated data, materials, 128 experiment design, 105 EXPRESS, formal description language, 123 extreme ultraviolet microscopy, 148

optics, 146

F

face recognition, image-based

systems, 103

facilities, use agreements, 38

Fastener Quality Act, 167

fast-pulse and waveform acquisition standards, research, 79

fiber optics

characteristics, 92

metrology, research, 91

sensors, 92

film, see thin-film

fine-structure constant, determination, 88

fingerprint classification automated, 36, 103 holographic storage, 107

finite-element modeling of complex

physical and chemical processes, 6

fire(s) -emulator/detector-evaluator, first generation, 46

detection and alarm, 45, 46

dynamics, 45

large, 45 measuring accurately, 46

oil-spill, 45

research

grants, 39

Information Service, 45

resistance of construction materials and systems, 42

Safety Engineering, division, 45

Science, division, 46

sensing, advanced, 46

service, law enforcement

standards, 77

suppression, 45, 46

flame(s)

extinguishers, 46 fundamental processes, 69

retardants, polymers, 47

Retardants Consortium, Environmentally Friendly, 37

flammability, properties, 47
INDEXES 175

flat-panel displays metrology, 81

test methods, technology, and

standards, 107

flowand chemistry in thermal reactors, 56

-injection technology,

optimization, 70 measurement

liquid-nitrogen, 75

research and standards, 54, 75 -meter development of low-gas flow

acoustic, 59

installation effects, consortium, 37

Testing Program, NIST-EPRI, 37

thermal mass, characterization, 59

reacting, simulation, 57

fluid(s) and fluid mixtures, properties, 66,

67, 68

flowmathematical modeling, 103 measurement and research

facilities, 75

simulation, 68

software libraries, 107

grinding, chemical and chemomechanical effects, 131

fluorescence, planar laser-induced, 56

fluorocarbon(s) chemistry of, 56 plasmas, etching and chamber

cleaning, 56

refrigerants, novel applications, 43

flux pinning in materials. examination, 129

foams, mathematical modeling, 103

focused ion beam, facility, 82

focused program (ATP)

adaptive learning systems, 8

catalysis and biocatalysis technologies, 9 component-based software, 8

descriptions, 8

digital data storage, 8

video in information networks, 8

information infrastructure for healthcare, 9 manufacturing composite

structures, 9 materials processing for heavy

manufacturing, 9 microelectronics manufacturing

infrastructure, 10 motor vehicle manufacturing

technology, 10

focused program (ATP) (cont.) photonics manufacturing, 9 premium power, 10 selective-membrane platforms, 9 technologies for the integration of manufacturing applications, 9

tissue engineering, 9

tools for DNA diagnostics, 9 vapor compression refrigeration technology, 10

force, measurement, 115

free radical (s) damage to DNA, 52

kinetics, studies, 64

optical detection, 64

frequency -domain

performance of sampling and

digitizing systems, 79

techniques, optoelectronic measurement, 91

-stabilized lasers, 159

standards, 156 fundamental and applied properties of adsorbents, 62

Constants Data Center, 145

physics, 139, 156

properties

for membrane separations, 63

of trace components of natural

gas, 62

studies of atomic spectroscopy, 69

Gaseous Electronics Conference

reference cell, 56, 80

gas(es) analyzers for semiconductor process

control, residual, 59

atmospheric, characterization, 61 chromatography, identifying organic compounds, 66

contaminant, measuring partial pressure of, 59

densities, measuring low, 59

flow acoustic flowmeter, low-, 59 -phase

species concentrations, 56

synthesis, nanoparticles, 55

pure, precise isotopic reference standards, 59 semiconductor processing, thermophysical properties, 63 thermophysical properties, 63

trace, analysis, 72

transport-property relationships, membrane separations, 63

gear involute artifacts, measurement, 110

gels, properties, 67

geographic information systems

(GIS), 100

geometry, computational, 104

giant magnetoresistance

effect, magnetic multilayers, 129, 147

read-heads, 141

gigabit networks, instrumentation, 107

glass fiber materials, automotive

applications, 135

global Positioning System

GIS support, 100

satellite-based navigation system, 117 time transfer, 157 Standards Program, 166 warming, 160 GOES Time Code Service, 163

grants

fire research, 39

materials science and engineering, 39

precision measurement, 39

research, 39 Small Business Innovation Research Program, 39 Standard Reference Data, 39

graphic(s) computer, techniques, 103 image manipulation, displays and, ATP projects, 16

scientific, 106

graphical multivariate data

exploration, chemical measurements, 6l

graphite-reinforced composites, marine and infrastructure

applications, 135 green body characterization, ceramic

processing, 132 Green's function library, 141

guest researcher agreements, 35 guided-wave microwave standards and measurements, 85 Guide to Available Mathematical

Software, 104

H

halon fire suppressants, 46

handprinted forms, automated data

entry from images, 103

hardness, standard test techniques, 105, 130

health

-care, information infrastructure, ATP focused program, 9, 14

health (cont.)

-related biotechnology, ATP projects, 20

see also medical

hearing aids, development, 125

heating, dynamic building system, 44

heat transfer measuring with calibrated hot box, 49

research, 43, 55 Henry's constants, dilute-solution thermodynamics, 68 hexapod machine tools, 118

metrology, 112 high-performance

computing and communications

information storage and

interconnect systems, 107 Systems Integration for Manufacturing Applications, 120

Construction Materials and

Systems Program, 41, 42

diode lasers, 157

sensors, infrared detectors, and

mixers, 88

Systems and Services, division, 106

high-speed communications, optical fibers, 105

microelectronics, digital circuits, 86

networks, 101

optoelectronic measurements, 91 high-temperature

superconductors

applying to precision electrical measurements, 78

database, 128

electronics, 89

interfaces and electrical transport, 89

materials for wire and magnet

applications, 128

thermocouples, 58 holographic storage, 107

hotline(s) European standards, 166

technical barriers to trade, 1 66 Hubble Space Telescope, high-resolution spectrograph, 160 Human-Computer Interface Technologies, 102 humidity measurement techniques, new generation, 59

hybrid fiber-coaxial systems, 101 hydrocarbons

decomposition in complex

mixtures, 65

polycyclic aromatic, 71

refrigerants, novel applications, 43

source of, 53
INDEXES

hydrofluorocarbons, thermochemistry, 57 hydrogen content in materials, 1 62

identity profiling, DNA , 52 imaging

analysis, computerized, 41 and measurement technology, ATP projects, 23

-based measurement devices, 42

compression, 104

diagnostic, 162

display systems, advanced, 81

for magnetic recording technology, nanoprobe, 90

medical, tomography, 148

nuclear magnetic resonance,

drying, 132

techniques, advanced, 148

visual, 42, 103 immunity testing, electronic equipment, 95, 96, 97 immunoassay-based techniques, automated sample preparation, 73 indoor air quality and ventilation, 43

industrial

fellow agreements, 1 67

Partnerships Program, 1 67

process reactor simulations, 56

infometrics, analytical, 73

information

Assurance Partnership, National, 101

capacity improvements for transmission and distribution, ATP projects, 14

infrastructure

for healthcare, ATP focused program, 9, 14 Protocols Consortium, National

Industrial, 122

networks, digital video, ATP focused program, 8, 14 Program, Standards, 166

retrieval, search engines, 105

services, 169

standards-related, 166

storage and interconnect systems, 107 technology and Electronics Office, ATP, 8, 13 ATP projects, 16 Laboratory, 99

visualization, 103

infrared

detectors characterization, 160 Comparator Facility, 153

long wavelength, 88

infrared (cont.

Radiation Facility, Low-Background,

153, 160

radiometers, development, 160

spectral radiometry, 153

infrastructure development technologies, ATP projects, 14

for healthcare, information, ATP focused program, 9, 14 microelectronics manufacturing, ATP focused program, 10, 21 inorganic and elemental isotopic metrology, 69

building materials, 41 compounds, thermodynamic data, 64

electroanalytical chemistry, 72

materials, crystallographic data, 128

inquiries, general, 3. 4

inspection system, in-process and

post-process, 116

insulation

facility, advanced, 50 measuring thermal conductivity with

hot-plate apparatus, 49

thermal performance of, 43

integrated circuit(s)

electrical interconnect reliability, 84

fabrication

infrastructure, 83

Laboratory, 97 Semiconductor Processing

Laboratory, 93

incorporating ultrasmall metal

tunnel junctions, 97 manufacturing processes, characterization, 84 measuring

features, 36

patterned layers, 111 metrology, 111 mixed-signal, testing, 79 new materials, ATP project, 7 next-generation, 83

ultra-large-scale, 105

see also semiconductor(s)

integrated infrastructure

for Electronics Design, project, 81

for Electronics Manufacturing, 82

integrated optics, metrology, 92

intellectual property, managing, 35, 167

intelligent building mechanical systems, 44 machining of ceramics, 131 processing of materials, 132

systems

architecture, 117 automated welding, 118

intelligent (cont.) systems (cont.

component-based approach, 119

division, 1 1

RoboCrane, 118

vehicle systems, 117

interactions of cold, trapped atoms, 150

interconnection, materials needs, 128

interconnect reliability, metrology, 84

interface (s) and adhesion, measurement, 128 and networking, sensor, 114

integrating "smart" transducers, 36 NCNR studies, 139 program, operator, 1 19

properties of, 153

specifications for advanced manufacturing systems, 120

standards, 118, 119

superconductor, 89

interfacial effects in polymer

blends, 134

international Organization of Legal Metrology, 1 65

standardization activities, 166 System of Units, 145, 150, 151, 168

trade, standards-related policies and

procedures, 1 65, 166

Internet Commerce for Manufacturing

project, 82

next-generation, 102

security, 101 see also World Wide Web

interoperable systems

BACnet, consortia, 37

North American ISDN Users' Forum, 37

interoperability system components, ATP projects, 14

testing building controls, 36, 44

standard, development, 107 STEP, 123

inventions, NIST-patented, 39

inverse problems, 103

ion

cluster, mobility of, 158

implanter, semiconductor

processing, 94

lithography, source, 149 /molecule reactions and clustering

processes, kinetics and

thermochemistry, 64

storage research, 156

trap technology, 70

Ionizing Radiation, division, 155

irradiation facilities, 139

ISDN Users' Forum,

North American, 37

isotopic metrology, inorganic and

elemental, 69

reference standards for pure gases, 59

JILA, 158

joining, cutting, and grinding, ATP projects, 22

Joint Army/Navy/Air Force (JANAF)

Tables, 64 Josephson

array development, 87

device, 78

standards, fabrication, 97

-effect, voltage standards, 78, 87

junctions, high-temperature

superconducting, 89 Journal ofResearch of the National

Institute ofStandards and

Technology, 4

K

kinetic-energy-enhanced epitaxy, microscopic basis, 158

kinetics, chemical, 64

laboratory

accreditation

fastener testing, 167 Program, 165 automation technology and

standards, 73

testing and calibration, 42, 165 language

process specification, 124

technology, spoken, 102

large-scale manufacturing, intelligent systems

integration testbed, 118 measurement, laser tracker, 112 Metrology Calibration and Research

Laboratory, 112

laser(s) cooling and trapping, 149

deposition of thin films, 158

diode, high-performance, 157 Doppler velocimetry, validation of flow meters, 54, 75

focusing of atom beams, 147

ionization of diatomic molecules in dense vapors, 149

isotope separation, 149
INDEXES 1

laser(s) (cont.) lead salt, 153 magnetic resonance, 157

optical techniques for temperature and concentration measurements

in fires, 47

polarization of neutron beams, 155

pulses femtosecond sum frequency generation, 153

time-resolved infrared spectroscopy, 154

observations, 154

radiation, fundamental atomic and

molecular processes, 6l

radiometry, measurement methods and standards, 90

scattering system, thin film, 158

spectroscopy, 149, 158

stabilized, 159

tracker, metrology, 112

ultraviolet, extreme, 160

vertical-cavity surface-emitting, 93

law enforcement standards, 77

layer(ed) measuring patterned, 1 1

structures, NCNR studies, 139

lead artifacts, measurement, 1 10

leap seconds, advanced notice, 163

length standards, sources, 157

librar>r

Research, NIST, 169

virtual, NIST, 169

licenses, 39, 167

life-cy cle costing, 47

lifeline systems, seismic performance, 40

light measurements, 151

scattering molecular mass characterization,

studies, 67, 153

surface observations, 62

linear systems, solution of large

sparse, 104

line heat-source guarded hot plate, 49

liquefaction, techniques for determining, 41

liquid-nitrogen flow measurements,

75

lithography, X-ray, 113

low-flow standards, measurement, 59 low-temperature

discharges, chemical and physical

processes, 80

plasmas, 148

refrigeration, advanced, 68 lumen, measurement accuracy, 151

luminescence spectral radiometry, 151 M

machine

controller, enhanced, 116, 119

data repository, 114

tool performance models and machine data repository, 38, 114

tools, ATP projects, 22, 23 machining

ceramic, 131 Research Facility, Precision, 113

virtual, 114 macromolecules

biological structure and function, 53 molecular geometry of, NCNR

studies, 139

potential components of devices, 53

studies, fluid behavior, 67

magnet(ic)

Engineering Research, facility, 141

facility, 16

instruments, characterization, 90

levitation solubility instrument, 63

materials mathematical modeling, 103

studies, 129, 155

microstructure, 147, 159

multilayers, investigations, 137

recording technology ATP projects, 14

metrology, 89 nanoprobe imaging, 90 scanning micromagnetic

recording system, 89

resonance imaging, 155

scattering studies, 137

superconducting, 89

systems, NCNR studies, 139

-tesla, 78 Thin-Film Fabrication and Imaging Facility, 98 manufacturing

applications, technologies for integration of, ATP focused program, 9, 15 ATP projects, 23, 24

competitiveness, 25 composite structures, ATP focused program, 9, 18 Engineering

Laboratory, 109

tool kit, 37, 121 Extension Partnership

center locations, 28

overview, 25

success stories, 26

manufacturing (cont.) heavy, materials processing, ATP focused program, 9, 21

infrastructure, microelectronics, ATP focused program, 10, 21 knowledge-based, ATP projects,

22, 23, 24

net-shape, ATP projects, 21, 22

photonics, ATP focused program, 9 product data exchange standards, 122 program, closed-loop, 113

resource data, 123

simulation, software, 121 Systems Integration, division, 120

technology, motor vehicle, ATP focused program, 10, 22

Testbed, National Advanced,

112, 118, 124 manufactured parts recognition, computational

schemes, 104

three-dimensional, 111 mass

flow converters, 63 fundamental unit, 115

research, 115

Standards, Facility, 125 mass spectrometry

see spectrometry

material (s) advanced technologies, ATP projects, 21, 22 and Manufacturing Office, ATP, 21,23

brittle, mechanical properties, 129

building, organic, 41

characterization, electromagnetic, 86

construction, 42

databases, 168

handling, intelligent vehicle systems, 117

magnetic, 90 Measurement Services, 168

Optical Properties of, consortia, 37

processing chemistry of, 55

for heavy manufacturing, ATP focused program, 9, 21

reactors, growth, 57 Program, Standard Reference, 168

Reliability, division, 126

science and engineering

grants, 39

Laboratory, 126

structures, NCNR studies, 139 mathematical and Computational Sciences,

division, 103

mathematical (cont. ) functions, 104 modeling, 103

representations of concrete

microstructures, 41

software, 104

Matrix Market, 104 measurement(s) and Standards Laboratories, 35

of partial pressures and moisture,

quantitative optical, 59

process

evaluation, 105

simulation, 111

services, 168

System, National, 168

technology for benchmark spray combustion data, 54

traceability, Standard Reference

Materials Program, 168

uncertainty, 105, 145 mechanical properties,

brittle materials, 129 medical and dental materials, 127

diagnostics, ionizing radiation, 155

dosimetry, 1 6

imaging

magnetic resonance, 155 tomography, 148

-Industrial Radiation Facility, 1 60

see also health membrane(s)

platforms, selective, ATP focused program, 9

separations, fundamental

properties, 63 mercury-containing dental alloys, hazards, 128 message passing interface, 107

metallic alloys, dendritic growth,

software libraries, 107

metallurgical

facility, monitoring electrical

properties of materials, 78

techniques, resistance standards, 77

Metallurgy, division, 126 metals data and characterization, 133

deformation, 141 hydrogen in, NCNR studies, 139

processing, 133

Metric Program, 164

see also International System of Units metrology

dielectric reliability, 84

electrical power systems, 80

fiber-optic, 91

flat-panel displays, 81
178 INDEXES

metrology (cont.

hexapod, 112

interconnect reliability, 84

isotopic, inorganic and elemental, 69 magnetic recording, 89 manufactured parts, computational, 1 1

microwave and terahertz, HTS devices, 89 modeling and simulation, 84

nanoelectronics, 82

optical characterization, 82

process and tool control, 84

scanning probe microscope, 83

silicon-on-insulator, 83

thin-film process, 83

micelles, properties, 67 microbeam analysis, 60

microcalorimeter, microwave power

measurements, 86 microeconomic analysis, 47

microelectromechanical systems (MEMS), 61, 85, 97

microelectronic(s) components, manufacture, 56

high-speed, 86 manufacturing

infrastructure, ATP focused program, 10, 21 measurement procedures, 93

materials measurement and

standards issues, 128

packages, system-level thermal

performance, 84

processing, chemistry of, 57

products, reliability, 84

programs, 77

microfluidics, 73 microform measurement, surface

finish and, 110 microhotplate designs, microsensors, 57 micromagnetic materials, modeling, 140 microphones, micromachined

silicon, development, 125 microscopy

atomic-force, 83, 90, 106, 149

electron, 106 extreme ultraviolet, 148, 159

infrared, 159 magnetic

force, 90, 98, 147 resonance force, 98

magneto-optic Kerr, 147

near-field scanning optical, 154

optical, 94, 106, 111, 115, 150

microscopy (cont.) scanning

capacitance, 83

electron, 41, 42, 61, 105, 110, 111

electron with polarization

analysis, 106, 147, 159

near-field magneto-optic, 98

probe, 83, 90, 98, 110, 111 tunneling, 58, 90, 146, 147, 158

X-ray, 148

microstructure(s) and dynamics of frustrated materials, 140 and magnetism, correlation, 146 atomic measurement techniques, 60

control, intelligent processing of materials, 133 development, ceramic processing, 132

electronic and structural behavior, 82

interfacial, polymer composites, 134 magnetic, 147, 159

metals, 133, 135

stresses in brittle materials, 130

studies, 139 microwave

-digestion technology,

optimization, 70

guided-wave standards and

measurements, 85 measurement, high-temperature

superconductors, 89

mirror systems, multilayer, 113

mobility

of cluster ions, 158

outdoor, 1 17 model(ing)

aerosol, 57 appearance of coatings, 42 ATM network, 101 BEES, decision support system, 47

building envelope, heat, air, and

moisture transfer, 43 cement and concrete structures, 41 chemical, 20, 65 CONTAM, air contamination, 43

coordinate measuring machines,

errors, 111 design tools for process equipment, 56

disaster planning, 45

display characteristics using

Princeton Engine, 81 eddy simulation, fires, 45

error, testing electronic systems, 79

film systems, 131

finite-element, 68, 14

fire hazard and risk prediction, 45, 47

flammability properties, 47

fluid properties, 67, 68

model (ing) (cont.)

fluid/solid-particle systems, 68

Henry's constants, 68 HVAC control system, 44

life-cycle costing, 47 Machine Tool Performance,

consortia, 38

magnetic materials, 129

materials, 135, 140 mathematical, 103 measurement process evaluation, 105 micromagnetic materials, 140

microstructure, cement pastes, 41 MOIST, prediction of moisture

transfer within building, 43

multivariate statistical, solution

processes, 63

nanostructures, 150 numerical, dielectric materials and

devices, 93

residual gas analyzers for semiconductor process control, 59 organometallic vapor-phase

epitaxy, 68

optimization, 47

organic building materials, degradation, 41 primary pressure standards, 59

processes, 62, 121, 132, 133, 135

product, 121

regenerative cryocoolers, 69 semiconductor devices and

packages, 84 smoke movement, 45

standard solder interconnect

geometries, 140

turbulent combustion, 106

terrain, large-scale, 104 thermomechanical behavior of coatings, 127 thermophysical properties of fluid mixtures, 66, 67 Wulffman, three-dimensional

crystal shapes, 141 moisture measurements, ceramic

processing, 132

quantitative optical measurements, 59

transfer within building, model, 43 molecular -beam epitaxy, 82, 94, 137

biology, facilities, 53

data, chemistry WebBook, 65 drag gauges, 59 dynamics

mathematical models, 103

particle nucleation and growth, 55

studies, 139

molecular (cont.

kinetics and excitation, 159 mass characterization, polymers, 130 measuring machine (M-cubed), 110

processes, fundamental, 6l recognition technology, ATP

project, 7

studies, equilibrium and

non-equilibrium systems, 67

monolayers, self-assembled, 58 monolithic microwave integrated

circuits (MMICs), 37, 86 motor vehicle see automotive, vehicle(s) multilayer magnetic processing, 129

materials, synthetic, production and

characterization, 150 multimedia and digital video, 101

test methods, technology, and

standards, 107 mutation detection, methods and

standards, 52

N ~

nanoelectronics metrology for, 82 molecular measuring machine, 110

nanofabrication

source, electron beam ion trap, 149

with atom optics, 147 nanometrology, 82

nanoparticle formation, molecular dynamic simulations, 57 nanoprobe imaging, magnetic

recording technology, 90

nanoscale

cryoelectronics, devices. 88

devices, research and metrology, 82

systems and metrologies, theory, 150

nanostructures

electronic properties, 146

fabrication of, 82

titanium thin films, production, 55 vapor-phase synthesis of, 55 nanotomography, X-ray, 148

nanotribology, magnetic hard

disks, 129

national Advanced Manufacturing

Testbed, 112, 118, 124

Center for Standards and

Certification Information, 166 Conference on Weights and

Measures, 169 Earthquake Hazards Reduction Program, 40, 48
INDEXES 179

national (cont.) Electronics Manufacturing

Initiative, 82

Industrial Information Infrastructure Protocols Consortium, 122 Information Assurance

Partnership, 101 Measurement System, 168

Quality Program, 33 Semiconductor Metrology Program,

Technology Roadmap for Semiconductors, 77, 83, 84

Transfer and Advancement

Act, 165, 167 Type Evaluation Program, 169

Voluntary Laboratory Accreditation Program, 165

natural gas

properties of trace components, 62

systems, thermophysical

properties, 66

near-critical processes, engineering measurements for supercritical and, 55

near-field

data, analysis of spherical, 87 measurements

photonic structures, 154

power, 96

optics, 150 scanning

characterization of antennas, 87

facility for antenna

measurements, 98

optical microscopy, 154

network(ing)

high-speed, 101

security, 101, 108

sensors, 114

standard interface, 36

synchronization, time transfer, 157 neutron (s) activation analysis, 74, 138 beams, chemical analysis, 74

beta decay, 155, 156

cold, 74, 136

depth profiling, 74, 138

diffraction, properties of gels,

micelles, and clays, 67

dosimetry, 156

-electron scattering length, 155, 162

interferometry, 139, 155, 162

lifetime, beam measurement, 156 phase contrast imaging, 162

physics, 139, 155

radiography, 139

reflectometers, 137

research, 136

neutron {cont.)

scattering Center for High Resolution, 137

density, 137

small-angle, 136, 162

surface observations, 62

techniques, 129

spin rotation, measurement of parity non-conserving, 156

standards and dosimetry, 139 tomography, 106, 155, 162 next-generation data communications, 93

data storage, 93

display, 93

inspection system, 1 1

Internet, 102 NIST-7, atomic frequency

standards, 156 NIST Center for Neutron Research, 126

noise

in electronic and optical systems, 157

optoelectronic measurements, 91

processes in high-performance

clocks, 157 temperature and figure measurements, radiometer, 86

non-destructive evaluation methods

bulk and thin-film ferroelectric

materials, 93

composites, 135

material-property and defect, 116

microstructure, 135

sensor development, 133

testing methods for structures, 41

non-disclosure arrangements, 1 67 North American Free Trade

Agreement, standards-related

aspects, 166 nuclear magnetic resonance, 52, 143 medicine, radioactivity measurements, 162

reactors, neutron dosimetry, 156 numerical control program

verification, software, 121

0

object-oriented

electronic component

representations, 82

finite-element modeling of composite materials, 141 numerical software design, 104

technologies, 44, 122

odorants, measurement in natural

gas, 62

oilproduction, technologies for

offshore, ATP projects, 18

-spill fires, 45

online search services, NIST

Research Library, 169 on-wafer metrology, research and

development, 86 open

architecture controllers, 1 1

systems architecture standards, 117, 118

operator interface, 1 1

optical absorption, software libraries, 107

adsorption-based standard for measuring low gas densities, 59

cells, in-situ measurements, 55

-character recognition image-based systems, 103

research, 107

characterization metrology, 82

data storage, measurements, 92

detection, free radicals, 64

diagnostics, synthesis of nanoparticles, 55

/electro-optical components and

systems, ATP projects, 17

fiber(s)

characteristics, 92

power, measurement services, 90

sensors, 92 Standard Reference Material, 91

filters, Standard Reference

Material, 72 manipulation of atoms and

molecules, 157 measurements

non-linear, 153

partial pressures and moisture, 59

properties materials, 159

of Materials Consortium, 37

of nanostructured materials, mapping, 154

radiation, measurement, 152

recording technology, ATP projects, 13

reflectance, 106

scattering measurements, 153

systems advanced, 113

noise in electronic and, 157

space-based applications, 113

techniques

for trace-gas analysis, 72 high voltage testing, 80

optical {cont.

)

technology appearance parameters, 42

division, 151 waveguide, planar geometries, 92

optics atom

developing, 150 nanofabrication with, 147 extreme ultraviolet, 146

integrated, metrology, 92

optimization and computational geometry, 104

design tools, 121

real-time, chemical processes, 153

optoelectronic(s)

division, 90 measurements, high-speed, 91 semiconductor devices, 93

sources and detectors characterization, 90

temporal properties, 91

orbital eigen-values, elements, 147

organic(s) building materials, 41 compounds

analytical mass spectrometry, 70

Henry's constants, 68 thermodynamic data, 64

trace levels, 70, 71

interaction of pollutants with clay, 67

spectral "fingerprints," 66

organizational structure, NIST, 5

orifice pulse tube refrigerator,

cryocooler, 68

Orthopedic Accelerated Wear

Resistance Consortium, 37 osmometry, molecular mass

characterization, 130

oxidation, semiconductor wafers, 93 ozone layer, destruction of, 36, 43,

46, 64, 66, 153

see also atmosphere, environment

p

packaging, electronic, 128

paint, Coatings Service Life Prediction, consortia, 37

parallel computing, 107

partial differential equations,

103, 104

particles (s) charged, fundamental atomic and

molecular processes, 61 dynamics, software libraries, 107 nucleation and growth, molecular

dynamics, 55
INDEXES

partnerships

industrial, 167

research, 35

technology, 167

patents, 39, 167

pattern formation in filled polymers, 141 permeability measurements

bulk materials, 86

gases and gas mixtures, 63

permittivity measurements,

bulk materials, 86

pesticides, 71 pharmaceuticals, macromolecular

structure, 52 phase

behavior in polymer blends, 134

composition, 143

contrast imaging, 155 diagrams

alloy, 134

for ceramic materials, 129

for ceramists, database, 128

shear effects, 134

equilibria diagrams, 36 measurement, 63 measurements, 162

transition studies, 1 62 photodiode

detectors for radiometry, 146

metrology, solid-state, 152 photolithography

film thermal converter structures, 79 semiconductor wafers, 94

photometry, 151 photonic(s) ATP projects, 16

devices, electronic and structural behavior, 82

information processing, test methods, technology, and

standards, 107 manufacturing, ATP focused program, 9

structures, near-field measurements,

154

Physical and Chemical Properties,

division, 62

physics

databases, 168

Laboratory, 144

neutron, 155 plane waves, incident, 96

plant layout, software, 121

plasma(s)

diagnostics in tokamaks, 160

etching processes low pressure, 56 chemical kinetic mechanisms, 57 fundamental processes, 69

low-temperature, 148

processing and chemistry

materials processing, 55

research, 80

semiconductors, 56

-spray research, 127 "plug-and-play"

compatibility, standard interfaces,

114, 118

factory, 82

polarization-dependent loss and

gain, optical communications, 92

pollution atmospheric, 6l

indoor, 43

see also atmosphere, environment

polychlorinated biphenyls, 71

polycyclic aromatic hydrocarbons, 71 polymer(s)

blends and processing, 3, 134

characterization, 130 combustion research, 3, 47

composites, 134

division, 126

filled, 141 -matrix composites, 41, 42 mathematical modeling, 103 potentiometry scanning, 90 powder

atomization processes, 134

characterization and processing, 142

diffraction data, 136

processing, 132

synthesis, 143 power

laser, measurement, 90

optical fiber, measurement, 90 premium, ATP focused program,

10, 23 systems

dielectrics used, 80

metrology, electrical, 80

pre- and post-flight X-ray

calibrations, 151

precision

electrical measurements,

superconductors, 78

Engineering, division, 110 Machining Research Facility, 113 measurement grants, 39

X-ray and gamma-ray spectroscopy, 150

premium power, ATP focused program, 10, 23

pressure -dependent chemical reactions, 65

quantitative optical measurements of

partial, 59 vacuum, and low-flow standards, 59 Princeton Engine, video supercomputer, 81

printed wiring board, advanced manufacturing technologies, ATP

project, 12 PRISE system, text search and

retrieval, 102 probe(s) broadband, calibration, 97

calibrations, 98

electromagnetic, evaluating impulse

response, 97

proximal, fundamental atomic and

molecular processes, 61

process(es)

analysis and spectroscopy standards

and, 72 and tool control, metrology, 84

control, 116, 132, 133

online diagnostics, 56

data, 124 manufacturing, 113 measurements

division, 54

evaluation, 105

near- and supercritical, engineering measurements, 55 planning software, 121 polymer composites, 134

Specification Language, 124

surface dynamical, 61 processing ceramic, 132

intelligent, 132 materials chemistry of, 55

intelligent, 132

metals, 133 plasma, semiconductors, 56 polymers, 134

visual image, 103 product

dataexchange

electronic, 81 National Initiative, 145

standards, 122 management, software, 121

testing, activities, 1 65

production, System Engineering

Tool Kit, 121

prompt-gamma-ray activation

analysis, chemical analysis, 74

proprietary measurements, 38

proteins(s)

folding, NMR measurements, 52

spectroelectrochemistry, measurement methods, 52

public domain prototype retrieval system, 102

public key infrastructure, computer

security, 100

pulse(s) and waveform acquisition standards,

fast, 79

-echo techniques, 116

laser femtosecond sum frequency generation, 153

time-resolved infrared spectroscopy, 154

observations, 154 measurements, ultrashort, 93

radiolysis of aqueous solutions, 64

ultrashort laser, condensed phase

chemistry, 154

quality

air, indoor, 43

assurance, Standard Reference

Materials, 168

construction materials, 42 measurement and data analysis, chemical measurements, 61

tools for, 72

control, methods, 155 measurement assurance, 155 Program, Baldrige National, 33

quantitative optical measurements of

partial pressures and moisture, 59 quantum

chemistry methods, 64

Hall effect, national unit of

resistance, 78

physics

division, 158 fundamental questions, 162

principles, tests and demonstrations,

162

processes, modeling, 150

quasicrystal structures with

icosahedral symmetries, display, 106

R

radiant power, high-precision measurements, 153
INDEXES 181

radiation accident dosimetry, l6l continuous wave, laser sources and

detectors. 90

effects and processing, l6l

industrial, processing, 16

interactions with matter, 159

ionizing measurements, 155, 1 6

processing, 155

quality assurance, 155 measuring unintentional emissions, 87

protection instruments, 156

ultraviolet, SURF, 159

radioactivity measurements, 36, 162

radiofrequency, radiation, biological

effects, 96

radiography, industrial, 161 radioimmunotherapy, 162

radiology, clinical, l6l radiometry

cryogenic

absolute, 88, 160

high-accuracy, 91, 152

infrared

facility, 160

spectral, 153

laser, 90

luminescence-spectral, 151 near ultraviolet, 152

photodi ode detectors for, 146

spectral, 152

thermal, 152 vacuum ultraviolet, 148

radionuclide

production, l6l measurements, 162

radiopharmaceuticals, 36, 162

radio stations WWV, WWVB, and WWVH, 163

radon, entry and transport, 43 Raman spectroscopy, standards, 60 random processes, 103

rare-earth doped solid-state waveguide lasers and amplifiers, 93

reacting flow simulation, 57

reactions chemical, pressure-dependent, 65

dynamics, 154

reactor(s) research, N1ST Center for Neutron

Research, 136

thermal flow and chemistry in, 56

real-time

controllers, software engineering, 119

control system, 117

video processing, Princeton Engine, 81

recording, magnetic, 89, 90

reflectivity, dissipative macrostructures, 97

reflectometry

in fiber, 91

neutron, 137

thin-film, 94

refrigerants, alternative, 36, 43, 63,

66, 153

refrigeration low-temperature, advanced, 68 machinery, 43

technology, vapor compression, ATP focused program, 10, 23

reliability

dielectrics in thin films, 84

electrical interconnect, 84 powder properties measurement

techniques, 132 remote

manufacturing, 119

monitoring, 72

sensing, 152

research and development

agreements, 35

contracts, 35

programs, 1 67

relationships, 167 and Technology Applications, Program, 167

grants, 39

resistance standards and materials quantum Hall effect, 78

research, 77

retrieval system, public domain prototype

retrieval, 102

technology, 102

reverberating chambers, 95, 97

risk management software, evaluation, 108

robots, RoboCrane, 118 Rockwell C hardness indenters, measurements, 110

role-based access control, first formal model, 99

roofing materials, 41, 42, 43

roughness, Standard Reference

Material, 110

sample(s) automated

preparation and sensing, 73

research, 70

preparation, chromatographic and

electrophoretic approaches, 71

sampling and digitized systems, time and frequency domain

performance, 79

Sapphire Statistical Characterization and Risk Reduction Program, 115

satellite(s) communications antennas, 36

determination of temperature of Earth's surface and atmosphere,

global positioning system, 117, 157 GOES, 163 scanning microscopy

see microscopy

scattering Center for High Resolution Neutron

Scattering, 137

inelastic, 137

light molecular mass characterization, :

studies, 67, 153

surface observations, 62

magnetic, studies, 137 measurements, optical, 153

optical, measurements, 153

reference instrument, multi-angle, 154

X-ray, small-angle, 142 S-Check, instrumentation product, 107

scientific computing, 106

visualization, 106

security technology computer, 100, 101, 105, 108 law enforcement standards, 77

surveillance, intelligent vehicle, 117

seismic design and construction

standards, 40, 48

see also earthquake

selective-membrane platforms, ATP focused program, 9 self-assembly biomimetic materials, 53 monolayers, 58 semiconductor(s)

assessment of wafer materials and

homoepitaxial overlayers, 151 chemical composition, NCNR

studies, 139

devices and packages, modeling and

simulation, 84

materials, and fabrication, ATP projects, 16

dielectric reliability, 84

Electronics, division, 82

etching discharges, 80

interconnect reliability, 84

ion implantation, 77

semiconductor(s) (cont.) measurement and standards, measuring patterned layers on

integrated circuits, 111 Metrology Program, national, 77, 128 microelectromechanical systems, 85 molecular-beam epitaxy, 82, 94

nanometrology, 82

) optical characterization, 82

optoelectronic devices, 93 plasma processing of, 56

process and tool control, 84

process control, residual gas

analyzers, 59

processing equipment, effectiveness, 84

gases, thermophysical properties, 63

Laboratory, 93 low-temperature plasmas,

properties, 148

reference material, 36 scanning probe microscopy, 83

silicon-on-insulator, 83

thin-film

process, 83

standards, 150 thermal process modeling, 84

see also integrated circuit(s) sensing, automated sample

preparation and, 73

sensor(s) -based process control, 116 broadband, calibration of, 97

characterizing plasmas, 56

electromagnetic, evaluating impulse

response, 97

fast-response, 134

fire, 46

high-performance, 88

infrared, 68

interfaces and networking, 1 14 magnetic, 129

magnetoresistive, 89

materials, 155

micro-, solid-state chemical, 57 multianalyte measurements, 58

optical fiber, 92

process, 113, 132, 135

production-line, 135

smart, 36, 114

technology, 133

separation (s) chemistries, microwave-digestion and flow-injection technologies, 70

processes

adsorbents, 62

alternative solvents, 62

use of membranes, 63
182 INDEXES

separation(s) (cont.) technology ATP projects, 20 membrane, fundamental

properties, 63

techniques for trace organic

analysis, 71 shear

deformation, 134

effects on phase diagrams, 134

flow on mixing and separating, 134 -induced phenomena, NCNR studies, 139

strength of masonry walls, 41 shearing cell, neutron scattering

studies, 67, 68

shielding effectiveness external radiation, 98

electromagnetic fields, 96

materials, automobiles, and

aircraft, 95, 97

radiofrequency applications, 95

structures and walls, 97

signal processing

algorithms, 58

techniques, 115

silicon CMOS technology, 77

-on-insulator metrology, semiconductor fabrication, 83

processing facility, 78

wafer measuring sheet resistance, 106

processing, facilities, 97

simulation contaminant particle nucleation, 57

large-scale chemistry, 57 molecular dynamic, nanoparticle formation, 57

reacting flow, 57 semiconductor devices and

packages, 84

techniques, 140

virtual machining, 114

sites, NIST, 4 Small Business Innovation Research Program, 39. 1 65 smart

buildings, 37, 44

token technology, 108

transducers, 36 smoke

plumes, oil-spill fires, 45

production measurement, 47

software component-based, ATP focused program, 8, 13 conformance testing, statistical methods, 105

software (cont.

development paradigms, creating, ATP projects, 13 Diagnostics and Conformance

Testing, division, 99 economic, 47

engineering for real-time

controllers, 119

libraries, 107 machine tool and robot control, 116

materials modeling, 147

mathematical, 104

quality, 99

recognition, databases, 168

standards, future, 100

testing, 100

tools, interaction with STEP, 122

solar energy generation, high-frequency diodes, 88

solderability, measurement, 128

solder interconnect design, modeling, 140

solid-state chemical microsensors, 57 imaging, 143 photodiode metrology, 152

reference standards, 78

solubility measurements

gases and gas mixtures, 63

of solids in vapors and supercritical

fluids, 68

of substances in liquid solvents, 68

solute retention, chromatography and electromigration techniques, 70

solution (s), thermodynamics,

dilute, 68

solvents, environmental and

health risks, 62 sonar arrays, development, 125

source identification, pollutants, 61

Special American Business Intern Training, 166

spectral dataChemistry WebBook, 65 NIST/EPA/NIH Mass Spectral Database, 66

irradiance standards, 152

spectrochemical analysis, 70

spectrometry

accelerator mass, 6l atomic, 69, 70

disk chopper time-of-flight, 138 Fermi-Chopper time-of-flight, 138

Fourier transform, 149

Fourier transform infrared, 153

highflux backscattering, 138

precision gas isotope ratio mass, 6l

spectrometry (cont.

mass 70

inductively coupled, 68

isotope dilution, measurements, 69

laser resonance ionization, 69

organics and biomolecules,

analytical, 70 thermal ionization, 69

spin-echo, 138

triple-axis, 137

spectrophotometers, measurements, 72, 106

spectroscopy

absorption, 59

applications, 153 atomic and molecular absorption, 159 fundamental studies, 69

cavity-ring-down, 59. 64 dynamic time-correlation, 67

far-infrared, 157 femtosecond laser, 61 Fourier transform

infrared 42, 72, 143

near-infrared, 73 Raman, 73

infrared near-field optical, 61

laser, 149, 158 microRaman, 143 multiphoton ionization, 64

multivariate infrared, 73

neutron Fourier, 162

nuclear magnetic resonance, 52, 53

optical, 159

photoelectron, 159 photon-induced ionization, 59

polarization, 72

precision X-ray and gamma-ray, 150 Raman, 55, 60, 73

standards and process analysis, 72

time-resolved infrared. 154 tunable

diode laser application, 72

far-infrared, 157

ultraviolet, 159

ultraviolet Fourier transform, 69

speed measuring equipment, 77

spindle design, ATP project, 7

splitters, optical communications, 92 spoken language technology, 102

spray combustion

data, 54

testbed, 54

-deposited ceramic coatings, 127

stabilized lasers, 159

staff, NIST, 4

standard(s) and Certification Information, National Center for, 166

capacitance, 88

Conformity Program, 167 Data Encryption, 101

Digital Signature, 101

experts at key embassies and

missions, 166

fast pulse and waveform

acquisition, 79

guided-wave microwave, 85

Information Program, 166

low-flow, 59 magnetic moment, 129 manufacturing, 120

organic building materials, 42

Policy, Interagency Committee on,

165, 166

pressure, 59 product data exchange, 122 Program, Global, 166 Raman spectroscopy, 60

Reference Data

for semiconductor industry, 80

grants, 39

Program, 128, 168

Reference Materials Program, 168

-related information, 166

Secure Hash, 101

Services, Office of, 165

software, future, 100 Standards Activities Program,

Technical, 165 superconductor, 88 vacuum, 59

voltage

ac, 79

Josephson-effect, 78

voluntary, 165, 166 Standard Reference Material (s) calorimetric, 64

ceramic processing, 132

coordinate measuring machines, 112

insulation, 43

law enforcement, 77

linewidth/pitch for photomasks, 111 magnetic materials, 129

metals processing, 133

optical

fibers, 91

filters, 72

retardance, 92 polymer characterization, 130

radiopharmaceutical, 162

roughness, 110 scanning electron microscopy, 110
INDEXES 183

Standard Reference Material (s) (cont.) spectral range. 154

thermal performance of windows. 43 wavelength calibration, 92

state Laboratory Program, 169

weights and measures, 169

static analysis tools. Unravel. analyzing changes to C language

source code, 99

statistical analysis of time-series data, 157 Engineering

collaboration. 105

division, 105

steel high-performance, 42

nitrogenated, corrosion resistance, 134

powders, atomization of. 133

protective coatings for. 41 STEP

conformance and interoperability

testing, 123

design information. 121 National Industrial Information

Infrastructure Protocols Consortium. 122

registry, 122

storage

data, 141

digital data ATP focused program, 8, 13

test methods, technology, and

standards, 107 high-performance, 107

holographic, 107

information, 107

optical data, 92

research, ion, 156

strength and ductility, precast concrete structures, 40

stress (es) and moisture in plastic packages, 128

in brittle materials, microstructural, 130

voidage, 128

structural

control, 41 performance. 42

structure(s)

division, 40

electronic, data for, 147

in biological membranes,

investigations, 154

large-scale testing facility, 48

photonic, near-field, 154

technologies for bridges and other

large, ATP projects, 18

substrate characterization, calibration of disc birefringence

testers. 92

subsurface damage in single-crystal components, 114 sum frequency generation. non-linear measurements at

interfaces, 153

superconductor(s) high-temperature

applying to precision electrical measurements, 78

database, 128

electronics, 89

materials for wire and magnet

applications, 128

integrated circuits, fabrication, 97

interfaces and electrical transport, 89 quantum interference device magnetometer, 78. 98

standards and technology, 88

structure and magnetic

characterization. 129

systems and devices. ATP projects, 17

supercritical

fluid mixtures, thermophysical

properties, 62

processes, engineering measurements for near- and, 55

surface(s) and interface chemistry measurements, 143 and Microanalysis Science,

division, 60

characterization, 159 dynamical processes, 6l

modification, ATP projects, 21, 22

reactions, biomolecular processes, 53

texture measurement, standard, 110

surfactants, surface modifications of adsorbents, 62

synchronization, time transfer and

network, 157

synchrotron radiation

resolution, 148 SURF, 159

synthesis of precise signals, 79

synthetic multilayers, production and characterization, 150

systems and network security, 101 and Networking Testbed Advanced

Manufacturing, 120

Integration for Manufacturing

Applications (SIMA), 44, 120, 123

intelligent, architecture, 117 manufacturing, 120

T

technical

barriers to trade, 166 Standards Activities Program, 165 technology at a Glance, 4

integration of manufacturing

applications, ATP focused program, 9, 15

licenses, 39

services, 164

transfer and Advancement Act, National, 165, 167

programs, 167 SIMA. 120 telecommunications, fiber-optic metrology, 91 telephone systems, wireless, 36

terrain, modeling, 104

testbed (s) Advanced Manufacturing Systems and Networking, 120 Advanced Welding Manufacturing

System, 118 ATM network, 108

computer-integrated construction, 44

Digital Video Interoperability, 108

engineering design. 121 high-performance construction materials and systems, 42

intelligent systems integration, 118

National Advanced Manufacturing,

112, 118, 124

next-generation inspection

system, 1 1

outdoor mobility, 117

spray combustion, 54

testing and calibration

laboratories, 165

text search and retrieval, 102, 103

texture, determining, 135

theory, condensed matter, 147 thermal

analysis, materials selection and

degradation, 41, 42

conductivity building insulation materials, 49

plasma-spray coatings, 127

conversion measurements, ac-dc, 88

converters, special multijunction, 79 imaging camera, 152 performance advanced insulation systems, 50

buildings, 48

walls, 49

windows, 43

thermal (cont.

)

radiometry, 152

reactors, flow and chemistry in, 56

-spray-deposited ceramic

coatings, 127

voltage, 79

thermistor mounts,

characterization, 86 thermochemistry data, hydrofluorocarbons, 57 thermocouple (s) high-temperature, 58 measuring temperatures in fire environments, 4? thermodynamic(s) and transport properties of fluids and

fluid mixtures, 67

chemical, 64

data, biotransformations, 52

dilute-solution, 68

thermometers

reference, wire and thin-film thermocouples, 59

transition-edge, 88

ultrasensitive, 88

thermophysical properties

alternative refrigerants, 66

fluids and fluid mixtures, 67

gases, 63

natural gas systems, 66 semiconductor processing gases, 63

supercritical fluid mixtures, 62

thin film(s)

deposition, chamber, 146

fabrication and Imaging Facility, 98

equipment, 89

process metrology. 83

images, STM, 158

laser deposition of, 158 magnetic, research facility, 159 measurements and standards, ceramics, 13

NCNR studies, 139

production facility. 150

reflectometry, semiconductor

processing, 94

reliability, 84

standards, development, 150

timeand frequency

division, 156

services, 1 63 -domain

performance of sampling and

digitizing converters, 79

techniques, optoelectronic measurements, 91
INDEXES

time (cont.

GOES satellites, 163

-resolved infrared spectroscopy, 154

-series data, statistical analysis, 157

Service, Automated Computer, 163

transfer and network

synchronization, 157

tissue engineering, ATP focused program, 9, 19 tokamaks, plasma diagnostics, 160

tolerancing and metrology

research, 120 tomography

computer-assisted, 148 high flux X-ray, 106

neutron, 106, 155, 162

tool(s)

control, metrology, 84

for DNA diagnostics, ATP focused program, 9, 19

kitManufacturing Engineering, 37, 121 Production System Engineering, 121 topography, 115, 116

trace components microbeam analysis, 60

natural gas, properties of, 62

organic compounds, 70, 71 elements, detection, 149

-gas analysis, 72

impurities, sensing, 157

traceability dimensional, 110

flow measurement, 54

ionizing radiation measurements,

155 measurement, SRM Program, 168

tracer gas methods, indoor pollutant concentrations, 43

trade agreements, standards-related

aspects, 166

training applied economics, 47

fire detection and alarm, 45

Special American Business

Intern, 166

weights and measures officials, 169

transfer mechanisms for measurement traceability, 168

transport properties molecular-level prediction, 63

of fluids and fluid mixtures, 67

transverse electromagnetic cells, 95

trapping atoms, 149, 150

ions, 156 Type Evaluation Program,

National, 169

ultrasonic(s) characterization of materials, 135 Flow Meter Testing Program, NIST-EPRI, 37

non-contact, 135

non-linear, 135

research, 116

ultraviolet

laser, extreme, 160

microscopy, extreme, 159

radiation

biological effects, 152 SURF, 159

radiometry, near, 152

uncertainties, measurement, 73, 105,

111, 112, 145, 169

user interface and

efficiency-enhancement

technologies, ATP projects, 15

V

vacuum

measurements, standards, 59

ultraviolet radiometry, 148 vapor compression refrigeration technology, ATP focused program,

10, 23 -phase synthesis of nanostructures, 55

pressure measurements, 62

vector network analyzers, six-port,

85, 106

vehicle(s)

intelligent systems, 117 motor

control, intelligent systems, 117 manufacturing technology, ATP focused program, 10, 22

technologies, ATP projects, 18

see also automobile

ventilation, buildings, 43, 44

vibration research, 115

video

display terminals, emissions, 96

visual performance, 81

in information networks, digital, ATP focused program, 8, 14

Interoperability Testbed, Digital, 108 multimedia and digital, 101

processing, 81 Technology Laboratory, 81

tools and management capabilities,

digital, ATP projects, 14

virtual environments, 103, 119

inspection module, 114

library, NIST, 169 machining and inspection, 38, 114 manufacturing environment, 114

reality

interfaces, 121 Modeling Language, 103

technology, NAMT, 124

viscoelasticity of polymers, 130

visual image processing, 103

perception, 81

visualization

factory floor assembly lines, 103

information, 103

scientific, 106

three-dimensional, 103 vitamins in food and serum, 71 VLSI Multikron clock chips, 107

volt(age)

high, testing, 80 measurements

ac-dc, advanced, 79

electrical characterization of plasma parameters, 56

ratio, 78

-meters, precision digital, 78

standards

ac, 79 Josephson array, 87

Josephson-effect, 78

voluntary Laboratory Accreditation Program, 165

standards, 165, 166 w

wafer(s) Probing Laboratory, 94

silicon-on-insulator, 83 waveform (s) acquisition standards, time- and

frequency-domain performance, 79

ac, synthesis, 79, 87 measurements, electrical characterization of plasma

parameters, 56

waveguides, optical, 92 wavelength

calibration, SRM, 92 measurements, precise, 149, 150 mercury, precise isotope shifts, 160

standards, calibration of Hubble

high-resolution spectrograph, 160

wavemeters

Fabry-Perot, 149

Fizeau, 148 wave propagation, 95, 135 Wear Resistance, Orthopedic

Accelerated, consortium, 37

weights and measures

lab projects, 36 Measurement Services, 168

Metric Program, 164

National Conference on, 169 Program, 169

state standards, 169 Welding Manufacturing System, Advanced, 118 wind

engineering capability, 46

load design standard, 41 windows, thermal performance, 43

wires, superconducting, 129 World Wide Web

electronic marketplace, 145 NIST

and Your City, 5 in Your House, 5 programs and services, 4

Physics Laboratory databases, 145

servers, reference implementation of role-based access control, 99

service, reference data sets, 105 SRD database accessibility, 168 SRM catalog, 168

see also Internet Wulffman, modeling three- dimensional crystal shapes, 141

X-ray

absorption fine structure, 140 and gamma-ray spectroscopy, 150

beamlines, materials science, 140

detector cryogenic device, 88

superior energy resolution and speed, 97

diffraction imaging, 140

materials selection and

degradation, 41 measurement capabilities, 131 microscopy, 148 nanotomography, 148

scattering, small-angle, 140, 142

technology, applications of, 151 topography, 115
U.S. DEPARTMENT OF COMMERCE

William M. Daley, Secretary

Gary Bachula, Under Secretary for Technology

National Institute of Standards and Technology

Gaithersburg, Md. 20899-0001

(301) 975-2000

Boulder, Colo. 80303-3328

(303) 497-3000

N1ST Special Publication 858

July 1998 edition

Production Virginia Covahey, Susan Ford,

Gail Porter, Sharon Shaffer, and

Anne Enright Shepherd

A903 Administration Building

National Institute of Standards and Technology

Gaithersburg, Md. 20899-0001

Any mention of commercial products

is for information only; it does not imply recommendation or endorsement by the National Institute of Standards and Technology nor does

it imply that the products mentioned

are necessarily the best available for the purpose.

(301) 975-2762