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HANDBOOK FOR OPERATION AND

MAINTENANCE OF AN NBS MULTISENSOR

AUTOMATED EM FIELD MEASUREMENT

SYSTEM

W.D. Bensema

G. H. Koepke

H.W. Medley

National Bureau of Standards

U.S. Department of Commerce

Boulder, Colorado 80303

October 1986

I

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-QC

100

.1156

86-3056

1986

NBSIR 86-3056

NBS

RESEARCH

INFORMATION CENTER HANDBOOK FOR OPERATION AND

MAINTENANCE OF AN NBS MULTISENSOR

AUTOMATED EM FIELD

' MEASUREMENT SYSTEM

W.D. Bensema

G. H. Koepke

H.W. Medley

Electromagnetic Fields Division

Center for Electronics and Electrical Engineering

National Engineering Laboratory

National Bureau of Standards

Boulder, Colorado 80303

October 1986

U.S. DEPARTMENT OF COMMERCE, Malcolm Baldrige, Secretary

NATIONAL BUREAU OF STANDARDS, Ernest Ambler, Director

CONTENTS

Page

Abstract 1 1. GENERAL INFORMATION 1

1 . 1 Introduction 1 1.2 Background Requirements 2

1.3 Implementation 2

1.3.1 Functional Diagram 3

1.3.2 Probes 3

1 . 3.3 Input Circuits 3 I. 3

.II Computer Software 4 2. EQUIPMENT SET UP AND OPERATION 4 2.1 Cabling 4 2.2 Computer GPIO Card 4 2.3 Amplifier/Digitizer Configuration 5 2 . 3.1 Front Panel 5

2 . 3.2 Front Panel Setup (High Impedance) 5 2 . 3.3 Amplifier/Digitizer Card Address 5 2.4 System Operation and Software 6

3 . SYSTEM SOFTWARE 6

3.1 SUB Program Descriptions 6

3 . 1.1 Multi probe_menu 6

3 . 1.2 Read_probes. 7

3 . 1.3 Probe_fill_cal 7

3 . 1.4 Apply_probe_cal 7

3 . 1.5 Get_cal_value 8

3 . 1.6 Errortrap 8

3.2 Examples

3 . 2.1 Example 1 8

3 . 2.2 Example 2 9

4. SYSTEM MAINTENANCE AND TROUBLESHOOTING 10

4.1 Probes 10

4.2 Probe Amplifier Cards 10

4.3 System and Interconnect Schematics 11 4 . 3.1 Probe Cabling Code 11

4 . 3.2 Backplane Interconnect Schematics 11

4 . 3.3 Interface and Cabling Schematics 11

4 . 4 Parts List 11 5. REFERENCES 12

APPENDIX Computer Program Listing 45
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HANDBOOK FOR OPERATION AND MAINTENANCE OF AN NBS MULTISENSOR

AUTOMATED EM FIELD MEASUREMENT SYSTEM

W. D. Bensema, G. H. Koepke, and H. W. MedleyElectromagnetic Fields Division

National Bureau of Standards

Boulder, Colorado 80303

A system is described that monitors and collects electromagnetic

(EM) field strength information at five (optionally 10) locations

simultaneously. The system has two modes of operation: (1) for

sampling EM fields that are stationary for times of the order of

200 ms, and (2) for sampling changing EM fields with a system

resolution of 10 ys. Sensing elements for Mode 1 consist of three

electrically short orthogonal dipoles mounted together, single

dipole elements, or small loop antennas. Each element feeds a separate data input channel for a total of 15 (optionally 30)

channels. Rf energy is converted to dc by a diode detector at

each dipole. Mode 2 sensors will be diode detectors driven by

broadband antennas. Real time system data processing includes

calculation of field strength based on probe calibrations and

processing of resultant data to satisfy measurement goals.

Key words: automated measurement; electromagnetic field probe;

high impedance; high speed; simultaneous sampling.

1. GENERAL INFORMATION

1.1 Introduction

This system was developed in response to work performed at the National

Bureau of Standards (NBS) directed toward characterization of the EM

environment in reverberation chambers [1]. One approach to mapping the EM

fields in a test chamber is to use a single probe and move it through the

area while continuously sampling the probe response. This has been done

using a track made of nonconductive materials on which the probe is mounted.

This method works well for environments which are stable and require a single probe reading at each location. However, some measurements require a large number of readings at each location (for example, to compute the

average field during one rotation of the tuner in the reverberation chamber)

which makes the track method very time-consuming.

A second method [2] uses several stationary probes at selected

positions throughout the test volume. This approach is more appropriate

when multiple readings are needed at each location. Problems associated

with determining the physical location of the probe and with the

perturbation of the EM environment due to bulky dielectric objects (track

hardware) are minimized with the multiple probe system.

1
1.2 Background Requirements

The system described in this report is the second generation

implementation. The list of specifications for the amplifier and data

handling portion of the system, includes the following desired

characteristics:

a. Multiple sensor input with adjustable gain to accommodate a wide

variety of probes.

b. Parallel data acquisition for simultaneous reading of all probes.

c. Interface to desktop microcomputer (for control and data

processing)

.

d. Channel modularity for reliability and maintenance.

e. Minimum size and weight.

In addition to the above, it was desired that the antennas and signal

detection portion of the system produce the maximum bandwidth possible for

the detected signal. While thermocouple detectors have good rms conversion

characteristics and high rf frequency response, they are relatively

insensitive and have response times of the order of 1.0 s, which is

considered slow for our applications. To reduce response time, Schottky Ntype beam-lead diodes with low barrier and as high a frequency response (low

capacitance) as possible were chosen. A reverse breakdown voltage of A V

results in an anticipated maximum measurable field strength of 1.5 kV/m.

1.3 Implementation

The system consists of an interface and backplane assembly with addressing capability of up to 31 card slots. (This number may be increased by

adding address lines to the hardware, but the need for a larger system has

not yet appeared). Each card slot will support one amplifier/digitizer

circuit card containing the analog amplifiers, analog to digital

(A/D) converter, and support circuits. The system samples all enabled

inputs simultaneously by strobing the A/D converters on each card in

parallel. After all signals have been converted from analog to digital

representation, the digital numbers are read out serially under control of

the desktop computer.

A system may be configured to utilize any or all addressable card

slots. The two systems currently being used have 15 and 30 channels.

This manual is written for the 15-channel (5-probe) system. It is

understood that the discussion would equally well apply to a system of 30

channels (10 probes), the only difference being the presence of more

hardware and the additional time required to read twice as many channels

after conversion.

2
1.3.1 Functional Diagram

Figure 1 shows the functional circuit blocks comprising one channel of

this 15 channel system. An antenna probe and resistive leads (not shown in

figure 1) supply a balanced, slowly varying dc voltage to the input labeled

"Balanced High Impedance Inputs." From here the signal is filtered,

amplified, switch-selected, and fed to an A/D converter. Upon command, the

converter converts the signal to a 13~bit digital number (12 bits plus

sign). The interface, under control of the desktop computer, transfers the

digital number to the computer. All 15 channels begin conversion

simultaneously. When all converters are finished, the computer sequentially

reads data from each converter. The system is reset and is ready for the

next measurement cycle.

1.3.2 Probes

This system was designed for use with two types of antennas or sensing

probes: (1) high-impedance, slow-speed, 8-mm dipoles which are supplied with

the system, complete with connecting cables, and are described below; (2)

low-impedance (50 to 2000 fi), high-speed probes for pulse work which are not

supplied with the system and will not be discussed further in this document.

Input circuits for future (optional) high-speed probes are, however,

discussed in the following section on input circuits.

The five high-impedance probes supplied with the system were developed

at NBS and are described in detail elsewhere [3]. The five probes each

consist of 3 individual miniature dipoles arranged orthogonally to pick up

electric fields independently of the direction of arrival. The probes have

an isotropic response of ±0.3 dB up to 8 GHz. They are designed to measure

fields from 10 to 1600 V/m. The frequency range is from below 100 MHz to 8

GHz. The initial shipment of probes has response from 8 to 12 GHz but with

some degradation of pattern. This implies an amplitude uncertainty of the

order of ±3 dB in the range from 8 to 1 2 GHz, in addition to the system

accuracy of ±1 dB.

Each individual dipole is a miniature, resistively loaded, tapered

dipole 8-mm long, as shown in figure 2. By itself it has a spectrum

response flatness of ±2 dB. However, since the use is intended for single

frequency test environments, amplitude corrections as a function of

frequency are applied in the computer section of this system, producing a system flatness of ±1 dB between 300 MHz and 8 GHz. The system can be used

at frequencies down to 100 MHz but flatness between 100 and 300 MHz is ±2

dB. Below 100 MHz and for lower strength fields, other members of a family

of probes may be used.

1 . 3.3 Input Circuits

The system has two sets of input ports with two different

specifications. The primary set, intended for use with the supplied probes,

has a high- impedance input and a slow response time. This signal path, when

selected, is directly connected to the analog to digital converter which has

a conversion time of about 200 ms. This requires that input signals be

stable (1 part in ^000) over this 200 ms time period. These inputs are

referred to as H i gh- Impedance (HI) throughout this handbook. They are

3
accessible through 50-pin D connectors on the rear of the equipment and are

intended to be used with 8-mm dipole probes connected by high-resistance

carbon-loaded leads.

The second set of inputs is intended for a higher speed response and

lower impedance antennas and detectors. The inputs are sampled by a sampleand-hold circuit, which is triggered by a pulse either from the desktop

computer or from an external source. This sample-and-hold circuit has an aperture uncertainty time of about 10 psec, which means input signals should

be stationary for that length of time. The input preamplifier preceding the

sample-and-hold circuit, has a bandwidth of 100 kHz, which matches the 10

ps specification of the sample-and-hold circuit. This amplifier inverts the

input signal and has a fixed amplitude gain of 50. A switch connects both

types of input to the A/D. As with the slower speed input, the A/D speed is

about 200 ms, with the sequential readout of all channels after conversion

requiring another 250 ms or so. The total time between high speed samples

can therefore be no less than about 500 ms.

1.3.4 Computer Software

The software was initially developed on a ^Hewlett-Packard (HP) 9836.

However, it is intended to operate on any HP series 200/300 machine. The

GPIO interface discussed in this handbook is common for all models in this

series. Software details are discussed in section 3-0.

2. EQUIPMENT SET UP AND OPERATION

2.1 Cabling

Figure 3 shows the cabling diagram for the rf probe system. Supplied

high impedance probes are shown. Optional high-speed components are not

shown.

Shielding of resistive line leading from the probes to the bulkhead box

(and their hardwire lines on to the interface) may be accomplished using

any of several means to suit local conditions. Common-mode rejection and

filtering remove most 60 Hz stray pickup, but the high impedance of the

input (about 20 Mq) makes some shielding of open lines desirable.

2.2 Computer GPIO Card

Figure 4 shows a diagram of the GPIO card (HP 98622A) which is inserted

into the back of the computer. The switches on the card must be set as shown in figure 4 for the system to operate properly.

^Certain commercial equipment is identified in this document. This

identification does not imply endorsement by the National Bureau of

Standards nor does it imply that the equipment identified is necessarily the

best available for this purpose.
2.3 Amplifier/Digitizer Configuration

The system consists of a series of identical amplifier/digitizer

modules or channels, each of which has a unique address which the computer

uses to interrogate the output of the A/D converter. For proper operation

each amplifier/digitizer channel must be configured for the specific

measurement and reside at a unique and legal address. (Note: each isotropic

probe requires three channels, one for each of the three antennas). The

amplifier operation may be configured on the front panel. The address is

set on the circuit board using the ADDRESS-SELECT switches.

2.3.1 Front Panel

The front panel shown in figure 5 is typical of each

amplifier/ di gi t i zer channel. The panel controls allow the operator to

select either the high-impedance or the high-speed amplifier section (switch

15, lower left position), and to adjust the zero drift of each section

independently via the active/zero switches (switch 13 in the upper left

position for high-impedance, and switch 16, upper right, for high-speed) and

their respective zero-adjust trimmer potentiometers (R9 and R12). The gain

of the high- impedance amplifier may be changed with the GAIN-SELECT knob

(switch 14) located in the center of the panel. The gain values are related

to the resistors associated with each switch setting and may be tailored to

meet specific needs (i.e., a new generation of probes with different output

levels). The final feature on the front panel is a channel select indicator

light (lower right position) which indicates when this particular card has

been addressed by the computer.

The high-speed section is not currently utilized and setup criteria are

left for future applications. The remaining discussions involve only the

hi gh- impedance amplifier section with the associated probes mentioned in

section 1.3.2.

2 . 3.2 Front Panel Setup (High-Impedance)

The switch settings shown in figure 5 indicate normal operation of the

hi gh- impedance amplifier. The high-impedance amplifier is selected (switch

15 ) and the input signals are connected to the amplifier by setting switch

13 to ’active'. It is assumed that the individual channels have been

previously aligned. Alignment is needed if the digital output is not zero

for a zero input (switch 13 set to ’zero’) or if other problems are noticed.

Refer to section 4.2.1, Alignment and Test Points for the recommended

procedures

.

2 . 3.3 Amplifier/Digitizer Card Address

When the input signal from each probe has been digitized, each A/D

is interrogated in turn by the controlling desktop computer. Each A/D is

accessed by the computer calling for one of fifteen addresses or channels

sequentially one after the other. If an amplifier is inserted or replaced

in the channel numbered 1, to be properly interrogated in sequence as the

first amplifier, the address switches must be set to 1. Figure 6 shows the

location of the address switch and an example address for channel 1 . Note

that only the first 10 positions of the switch are used. Also note that

5
when rocker switches are used, the depressed side selects the function; on slide switches the raised portion denotes the function selected. Both

rocker and slide switches are installed with open (off) to the left, and

closed (on) to the right. Figure 7 shows the address select switch coding

needed to select up to 31 channels; only the first 15 are used in this

equipment

.

2.4 System Operation and Software

First the system hardware is assembled. Next the computer is booted up

in its basic operating system, and the software supplied with the system

is loaded into memory. Operation is commenced by depressing the run key. A

detailed discussion of the software is covered in Section 3.

3. SYSTEM SOFTWARE

The software for the NBS multi-probe system is written for HewlettPackard series 200/300 laboratory computers in HP Enhanced Basic. The

program controls the GPIO interface and supplies all control signals to the

probe system hardware. As may be observed by looking at the hardware

information, the probe interface board has no provisions to latch

information and relies entirely upon the GPIO card to maintain internal

conditions.

The program allows the operator to configure the system to any given

combination of probes and amplifiers within the limits of the available

hardware and to extract the correct calibration data for that antenna.

3.1 SUB Program Descriptions

The software allows relatively simple integration into larger

measurement programs. The multi-probe system is recognized as part of a larger rf generation and measurement laboratory system, and the measurement

programs will consist of modules controlling many different instruments.

The multi- probe system programs are constructed as SUB programs that may be

loaded and CALLed by the main program written by the user. These modules

(SUB programs) are defined as follows:

1) Multiprobe menu

2) Read probes

3) Probe fill cal

4) Apply probe cal

5) Get cal value (general purpose

)

6) Errortrap (general purpose

These modules are interrelated; ’ Mult i probe_menu ’ ,

' Read_probes ’ , and

’ Apply_probe_cal • provide the necessary linkage to a main program. A

description of the structure and functions of each module follows.

3.1.1 Multi probe_menu

This module provides all the system definitions and linking parameters

necessary for operation of the system. A series of parameters defines the

6
hardware configuration and the number of antennas available to the system.

These parameters are defined in the program listing given in appendix I.

An array of index values is established as a result of interacting with

the menu selections. These values define the probe connections and the

calibration values to be used when the A/D readings are interpreted. The

user can connect the antennas to the amplifiers in any order and must then

reflect this information in the menu selections. A large part of the code

in this module provides a simple means of adding, deleting or moving antenna

connections among the amplifier channels while maintaining all the correct

index values in the linking array ’Probe_addr(*) ’ . The configuration can be

saved on a floppy disk (to be defined by the programmer in the main

program), and the linking array can be printed for help in debugging the

system. The module titled ’ Probe_f ill_cal ’ is called by the menu SUB

program to initialize the calibration data files to interpret the A/D

readings. A complete description of the variables used is provided at the

beginning of the menu program.

3.1.2 Read_probes

This module performs the actual measurements by calling the necessary

routines to read and interpret the readings. Along with the menu routine,

this SUB program provides the required link with the main program to operate

the probe hardware. The main program can specify that several readings will

be averaged together; this average value or a single reading of each channel

may be specified. The program will always read all amplifier channels that

were specified in the menu and passed into the linking array. There is no provision for selecting subsets of the configuration without returning to

the menu and performing the desired changes.

This module contains the subroutine that actually toggles the control

lines on the GPIO such that the measurement sequence is initiated and

readings taken from every A/D converter specified in the linking array. The

setup and read sequence may be easily followed by reading the program in

appendix I. The address of the lowest numbered amplifier channel is first

set as this becomes the trigger channel for the interrupt signifying

completion of the A/D conversion. The initial control signals are then

established, followed by the sample/hold circuit going into the hold mode.

The start conversion pulse is then generated (simultaneously to all

channels), and the interrupt is enabled. The computer idles until the

interrupt is detected and then proceeds to read the A/D converters

sequentially. The data is masked to 12 bits and checked for an overrange

bit. Corrections and calibrations are not applied at this point.

3.1.3 Probe_fill_cal

See the last two sentences of the Multi probe_menu description.

3.1.4 Apply_probe_cal

The information returned after reading the probes is the decimal A/D

output, which is proportional to the probe output voltage. When the system

is reading the zero field offset values it is not necessary to translate the

A/D values to field strength (see example 1 section 3.2.1). The zero field

7
offset corrections are exactly those A/D readings. These corrections

compensate for any amplifier drift that may occur. This module is called by

the main program only when actual measurements are in progress and values of

field strength are required (see example 1 section 3-2.1). This module

translates the A/D readings into electric field strength in volts/meter.

The calibration values for amplitude are the coefficients of a two-parameter

curve fitted to calibrations taken in a transverse electromagnetic (TEM)

cell at 300 MHz. There are two sets of parameters for each antenna because

the response of the diode extends from the square law region to the linear

region, and one equation will not cover both regions adequately. The

frequency response of the probe is also corrected based on calibrations of

the antenna in the anechoic chamber at several frequencies. Hence this

routine requires knowledge of the measurement frequency. The common point

for the amplitude and frequency calibrations is 300 MHz where the amplitude

detail is given. All frequency response data are then related to a given

amplitude at 300 MHz. The sequence of correction is to apply the curve fit

equation to the A/D reading to get an equivalent volts/meter at 300 MHz, and

then make corrections for the actual frequency of operation. If the

frequency is outside the limits of calibration, no modification is applied.

The results of this calibration reside in the Probe_v_m(*) matrix in the

order given by the Probe_addr ( *) linking matrix.

3.1.5 Get_cal_value

This is a general purpose module (which may be used by any other

routine) that performs a binary search along the X axis of a file and

returns a Y value as a linear interpolation between data points. The

Apply_probe_cal uses this routine for finding the frequency calibration

value to be used from the data given. The file parameters must conform to:

File ( i , 1 ) = X value

File (i,2) = Y value

Target = real number indicating the X value to search for

Result = real number returned, the Y value at target

Endpoint = index of the last data point (i) in the file

Baddata = flag that is set if there is an error or the

Target is outside the x range of the file.

3.1.6 Errortrap

This is a catch-all error handling routine that is necessary for

proper disk operations, etc.

3.2 Examples

3.2.1 Example 1

The following is a suggested method for interfacing a measurement

program to the multiprobe system. It assumes that all COM declarations

reside in the main program giving access to the variables.

8
Measurement program code

If

M

I!

! Remove rf power

It

! Read zero field offset values

If Total_chans > 0 THEN ! do only if probes are active

MAT Probe zero = (0) ! not necessary, but good idea

CALL Read probes (@Gpio) ! read all active probes

MAT Probe zero = Probe_volts ! set values, must do

END IF

If

II

II

ItM

It

! Set up measurement environment, apply rf power

II

II

! Read the probe system

IIIF Total_chans > 0 THEN ! do only if probes are active

CALL Read_probes (§Gpio) ! read all active probes

Too hot = 0 ! begin search for overranges

FOR P=1 to Total_chans

Too_hot = Too_hot OR Overrange (P) ! look at each

NEXT P IF Too_hot THEN ! do something quick

GOSUB Reduce_power

GOTO Restart_point

END IF

! not overranged, so interpret

CALL Apply_probe_cal (Frequency)

END IF

GOSUB Print_results ! Print results as in Probe_v_m(*)

GOSUB Save_results

II

II

It

At this point the results are in the matrix called Probe_v_m ( * ) . The

values are in the order dictated in the Probe_addr ( *) matrix.

3.2.2 Example 2

You have selected amplifiers 5,6,7,8,10,12 with probes 2-Y, 2-Z, 3“X,

3“Y, 4-X, 4-Y respectively, then Probe_v_m(*) would contain the readings of

the probes in that same order.

9
i.e. Probe v m(1) = 2-Y reading in volts/meter

Probe V m(2) = 2-Z

It

tl

ftProbe V m(6) = 4-Y reading in volts/meter

Also note that Total chans = 6 for this example.

4. SYSTEM MAINTENANCE AND TROUBLESHOOTING

4.1 Probes

Probe diode integrity and resistive lead integrity can be determined

with an ohmmeter. However, care must be taken that no ohmmeter is used with

a maximum output of more than 4 volts. This continuity measurement should

be made at the pins on the probe connector, to keep some protective

resistance line between the test meter and the probe diode. The diodes are Schottky diodes which are very subject to static damage.

A test jig that normally inserts 2 Mn across the line must be

constructed before testing. See figure 8. When the push button is pushed,

the jig inserts 1 Mn in series with each side of the line and removes the 2

megohms across the line. Trouble is indicated if there is an open circuit

(infinite resistance) or short circuit (the same reading in both

directions). Forward resistance should be 3 to 3 1/2 MJ2 including the line

and series resistor. Normal back resistance will be in the range from 7 to

20 Mn.

If probes are found to be unserviceable, and are replaced with new

probes, the calibration curve contained in the computer software should be

replaced with the curve corresponding to the new probes.

4.2 Probe Amplifier Cards

The overall schematic diagram for the rf probe amplifier card is given

in figure 9. More detailed schematic diagrams are given as follows:

When the system was initially delivered, all 15 probe amplifier cards were properly aligned. The most common indication of need for simple zero

adjust is non-zero digital readout with zero signal input. This is

generally taken care of by adjusting the zero control on the front panel.

If a more complete alignment is desired, the table in figure 15

delineates a complete alignment sequence. Figure 16 shows test point and

potentiometer locations on the probe amplifier card.

Schematic Diagram Title Figure Number

High- impedance amplifier

High-speed amplifer

Clock squaring and regulators

Address circuits

Analog to digital converter

10

1

1

12

13

14
If the card is suspected of not working properly, the table in figure

17 gives a list of normal test point data. Figure 18 illustrates typical

system waveforms at the analog to digital converter. These may be used to

assist in locating card troubles.

4.3 System and Interconnect Schematics

4 . 3.1 Probe Cabling Code

Figure 19 shows probe pin numbers and color codes. Figure 20 shows the

10.7 m (35 ft) rf probe amplifier cable color code and SMA cable pin

assignments

.

4 . 3.2 Backplane Interconnect Schematics

This system uses fifteen separate amplifier cards, with the outputs all

connected in parallel using tri-state logic. These paralleled outputs, as well as controlling input lines, are connected through an interface to the

controlling desktop computer. Figures 21 and 22 show the interconnections

employed on each backplane. Each backplane is (1) capable of holding up to

8 individual probe amplifier cards, (2) capable of being connected to other

backplanes via jumper cables, and (3) capable of being connected to an interface card via jumper cables. Figure 23 shows the backplane component

locations. System primary power is ± 15 V, which is injected into one backplane plug, J25 or J30, and distributed by daisy chain connections to

other backplanes and to the interface card. All 5.0 volt power is generated

by regulators on each individual card.

4 . 3.3 Interface and Cabling Schematics

The interface card is mounted on the back of one of the backplane

cards. It is used to interface digital signals to the computer. It also

contains the 250 kHz sinewave oscillator whose signal is fed to each card,

where it is squared, and then used to clock the analog to digital

converters. The interface card also has alternate input ports and switches

for selecting Track/Hold and Start (the A/D converter) signals from a source

other than the computer. Figure 24 shows the schematic for the interface

card. Figure 25 shows the interface card component locations. The table in

Figure 26 shows the interface cable color code. The cables are connected to

the computer

.

4.4 Parts List

System parts lists are listed in the following 3 figures:

Figure Number Figure Title

27

28

29

Probe amplifier parts list

Interface parts list

Backplane parts list
5. REFERENCES

[1] Crawford, M.L. Evaluation of a reverberation chamber facility for

performing EM radiated fields susceptibility measurements. Nat. Bur.

Stand. (U.S.) IR 81-1638; 1981 February.

[2] Bronaugh, E. ; Rose, M. Jr.; Rethmann, H. Multiple isolated probe

electromagnetic field measuring system. IEEE Internet. Symp. on

Electromagn. Compat. 80 1538“8; Switzerland. 151; 1980.

[ 3 ] Kanda, M.; Driver, L. A broadband electric-field probe using

resistively tapered dipoles, 100 kHz - I 8 GHz. IEEE Conf. EMC; 1986

September (in preparation).

12
ONE

OF

15

MODULRR

CRRDS

13

Figure

1.

Block

diagram

of

multisensor

automated

EM

field

measurement

system

.
14

Figure

2.

The

8mm

thin-film

dipole

antenna

composite

diagram.
3

nxis

RF

PROBE,

WITH

PROTECTIVE

PLRSTIC

CRP

Q

CE - U QC DC _J O O1— u U n u > CE LJ

(-1 2 U 2

h“ _l

cnO

O

n

U ^ t-.

U

tn > cn u (J u t-H (J

u

CE 2 i-i •“ LJ 2 l-H n 1— cn tt! 1—1 1

n iC (S) o 2 LO

1- cn CE tf)

H I-i CE

Li. > _J Ul 6 > _l CL CE CL cn 2 2

l-H >- (-n >- CL U u. CL U

DC s CE

—' cn (J n Ul

cn _1 r-1 m

LJ 1- CE

1- Liu o2 in CL

U-l cn 2 1 1 CE 2 U

CDO

DC (S CL

U.CE

uQ cn m • u

CD CL 2 2 2 m

hH e: CE u u - CD l-H u U 0. u 1

_J > u n CD CE O U I - U 1- 1

2 X u

Ul CE CE 2

CD 2 2 P O 2 u

1- CL l-H U 2 2

cn I— Q 2 U CE

CE

Q CO 1

u

UU

_l CE 2 2

CE

u

OU

U

CE > H 1—1 P

CVI l-H CL l-H cn 1

X X cn

to cn o h- 2

CD t—1

CD l-H CD LO CE U P P

CL CE CE (Si

u I U t-i p

II CE I 2 o CE 2 (Si U

t-t 1

2 1—1

l-H CL X 2 I I

in (J

u

mH P u1

' o cn cn 2 ^ cr Q ^ n LxJ u

5: E

CK

— Ul o a n q;

CL CE ei u

(Si u

u CL l-H I— ICE o U 2 P s

csn\ss

OJ

15

Figure

3.

Cabling

diagram,

rf

probe

system.
16

Figure

Setup

for

GPIO,

HP98622A

as

used

on

HP

Series

200/300.
nzu

CLo sQ (S

Li_Ll.Li- O O O 2 Z

UJU Z Z Z CL Q.

I—I t-H l-l

O

O

CC (T CE

(j (j (j

inu

CL

Z)o

U)uo m CL — CL z

cni-z

UJ

(J z in ur u

ZCL

(JZ) H

_J

u

CE

Uo

cn CL CL CL

UJ

CLDauuo1 Qc ‘ CL

CO zuzz

(J

_)

CE _l(E

17

Figure

5.

Front

panel.
Q

U

tn

Z)

oz

n

t/1 z

o

LDo

D.

Z

in

L)Ld

_l

Ld

inin

in

Ld

QLn

a

CE

ino

Q.

in

m

ct: CO

OJcr

OJ

0^

in

LdI

U

z

Ln

LO

inu

CKa

a

cr

\TU

CO

[Y

N > o o

LD

CK

XZ>ZI )-UlQLQ.ZZ_JiL'-)ILi_unuPQa:

OOOOOOOOOOOOOOOOOOOO

18

Figure

6.

Address

switch

selection

[CH

1

shox^m]

.
CLOSED

(ON)

8.

BLANK

=

OPEN

(OFF)

S10 1

CD

0)

CD

in • • • • • • • • • • • • • • •

IN. m •

CD

LO

inm

inm

Ln • • • • • • • • • • • • • • • •

CM

in

cn

aQ

or

- CM CD in to CN OD (D G3 -

(\J fO in to CN CD cn S)

(M CM

CM

CM CDCM

TTCM in

OJ

UD

CM CM

CD

CM

CD

CM QCD CD

19

Figure

7.

Address

select

switch

coding.
E

s:

20

Figure

8.

Probe

test

jig.
CEC

DB0

DBl

D62

D63

0B4

DB5

DB6

DB7

DB10

DBll

DB12

OVRG asY

BUSY

STEM

Figure 9. RF probe amplifier general schematic. See figures lo, 11, 12,

13, and 1 1) for more detailed schematics containing component

values, etc.

21

DRRNING

NO.

HIMP0002

u:(S

K)QO

I—

CE

NX \nNI

(J

h-ZU

LO

XI

I—) nXuI

cn

I-z

I—I oX

h-zuz(—cnz•“) U ; auXuQ ai •• a

Ld • LJ

cn

m z n X z ^

o=>

I- ^ z X X I

x^z

r-,

X Ld in I- X !Z 5 S X 3 t- X o ^ ^x3 ^ I-I X X I > u ^

!z

u

X z X P Z!

L- 2 o 9 X y

zX

5s

xy^ o => X 5

CC , , oX ss X *- X

IXo

x' z X t—I m X O (J XX I a X X ru

Xo

(S) I—I — XX XO I X z u uX

a I i-i X u X X z -- z• X IPJ X o

PJ o z Xoz X I I I I X — pjpn'j- z X X X g I m X (j (j X

23

GR5-

NOT

USED

O

THIS

SYMBOL

WITH

LETTER

INSIDE

INDICHTES

HARDWIRED

CONNECTIONS

TO

THE

FRONT

PRNEL.

CEC

IS

USED

TO

DENOTE

THE

CHRD

EDGE

CONNECTOR.

[0

RMPLIFIER

CARDS

PLUG

INTO

BRCKPLRNE

SOCKETS

LABELED

CONI

THROUGH

CON0I.
LD

CL

I X

+ 1

24

Figure

11.

High

speed

amplifier.
+5V o—vw

O

(J

CTQ

U

M

Ld

A

AA

u

LJ S LD aj Urv

LD IT) LO LD \ \ \ \

cn LD cn

in LD ID LD 1

X

CL z > > n K Z HH LD LD ~z. Ln

(—t Z U

Ln £ z Ln +

L9

(J

l-H Q

CK Nl > I

QDQ Ln

rvi

u

LnZlanuX

LO

H-O

CLuXI

LOzn

(TU

I-o

LOzouuouQU

(XQ

CXX

Lnu

I-zuua

cn

Ld^J n zo

Ln:uXui—i

Li_

Q_ • ZH “

QD

Lnu omzz

Ln

Ln

HH

X. <J o ^ ^ £ U •“ iiD r-, (j a a H a S Xz -I u |-

guzu n CL u on -g

cnz o U 3

^0^

•ac

CT3

s-03 o •1^

<di

4-3 J-

(C

4-3

rH

Q.S

(0

m

Cl) - XD

4-3 ou a a. o

£-

•iH

0) x:

4D) o

t- bO o C (i-. •rH -

n3 4-3 3 •*H cr 3 m O

t. :x •»H o o o1—1

t- o o

4-3 <*H CO o >—i 3 E to

CO 0)

ScO 4-3

•f-H rH •o o>

4-3

•r—1 o 3 ,

O

C- 1 •»H o +

C\J

<u

I-D

bO

-f-i Uj

25
o

z

(J .o

u

;

f uSJ Pu3

n

Qia

aj

26

Figure

13.

Address

selection

circuits.
DRAWING

NO.

RTOD000G

OQQ

S — r\j m ^

CQ ffl OQ CQ Q Q Q a Q

in UD

QQ CD Q QCQQ

Q

CO CD —

CQ OD QQ Q CQ Q

rvj m

CQ

L±J t—

c/}

in

(S(SQ

aQ

Q

(T O

z

Q_ • CECD si

I

• o oo

i-a

uj >— z

t0)L

(U>co

o

nj

4-> •rH bO

TDO

4-i bCO

I—

I

(0c<

<uL

3

bO

•fH

27
muDa

LxJ uo

CK

Q.

U1rz

(j

_ja:

Ol3 o 3 X

X

O

up

u z (J 01

U > z N z X • 1- o HH 3 X o - X 3 o n 3 1—1 X 3 3 (S l-H Z o hH X

0-

U

X 1-

O s 3 o 3 .. 2 3 z X z 1—1 z > Z • n l-H z N

(Luu 01 1—1

HH in Ol 3 3 o P

t-l o CS3 + O l-H 01 l-H Z O

n oi

X

X

Q

X

X 01 3 1

X 3 u X u u o o 3 l-H UJ u u H d 3 3 u X P Ol » 1

0-

XX

u i-i 1—1 u

X o z 01

Lfl 1XI z 2 + 2 1

z o X o 3 u X X Ol 01 01 X X - hH 3 X (J Q o 3 a u P p 3 P

(J o o uO 3 o 3 3 N 3 u hH

X -H 1- 1- X X X a X U u 01 X z u 1

u X z z l-H X O * oi H l-H N Ol N t—1

hH

X OlX P z 1- h- X 3 \ 3 \ 3 o X 3 u X X XI 3 U z X O o X o 3 1—( X X H (J U a U o (J X X (J X hH H H z 3 1—1 z X z l-H l-H u u l-H 3 3 1—1

ZD

n > O

X

XX 3 XN

NXN

X 1^ o - a

n \ O z H U z z u z XI 01 z u z z z X o Z) U * 3 1—1 X o X O l-H u l-H l-H hH 3 u o z N Z z l-H z X z N X X 1—1 1

1—1 3 1—1 1

X 01 3 O

Qa z u

n

U

up

uuX Z I—1 u Q n XI X 01 X u u u m u 3 n X LD z 3 (J O u z 3 X o 3 N S z u n X n X u z X UJ \ Ol

1—1 X

X 01XXn Ol l-HX 01 P 3 o 1- o U u 3 P

hX 1—1 X

XX

U XI

XXXX

X 3 O

(J 2 z 1- z X z z (J 3 z XX 1— 1—{ 1

X 1—1 X 3 l-H X l-H l-H X Ol X

01

XU 01 2 nX 2

X) 01 3 XuXX

XXXX

uu 3 1— o X 3 (J 3 p P 3 (J 3 a KH X a HH z z 1—1 n l-H z Z HH hH hH X H H X 2 X HH 2 X 2 X X 2 X 2 3 2

01 3 3 p 3 3 O Z O m 3 O o 3 z O X z 3 3 3 o 3 o hH X hH X X X 1— 3 Z 1— X X U 3 o U 3 z Z z X z z 3 3 3 l—I 3 3 o Q Z 3 U 1— 3 3 1

hH

u 1— 3 3 3 O * - 3 - ai X X X X X m 3 3 3 .—1 u 3 U 1

3 3 3 3 OJ 3 • 3 3 1

01

XX z O z O

01 3 u 3 3 3 o o o 3 O O X O p O 1

X 3 X 3 3 p Z z X 3 X 3 X

in z U3

X 3 3 X IV 3 3 3 X 1—1 3 > p hH P 1—1 z z Z Z f\- Z z X (J X (J

hH hH in

X hH (M hH o 3 hH 3 hH

XXX

—• X

XXXuX P X P

(—1 3 n

r-1 o 1—1 3 3 3 3 X 3 O 1—1 1—1 3 O 3 o • X h- 3 Z X Z z p X P P O p O X X 3 X X X 2 X 0. X X X 2 X Z o X 2 X X X 3 o o S o o 2 3 (3 3 Z p m S m Q m 3 Z S z o Q '

• »—• Q o ' - o X —' u 1—1 u 1—1 u 1 1 U X 1 1 X z 1 1 X X X X 1—1 3 3 o 3 IV in 3 u 3 z z 3 z m z 3 z z X o X o X o CK o X o X o , 3 3 in 3

28

Figure

15.

List

of

alignment

procedures.
29

Figure

16.

Probe

amplifier

parts

locations

for

alignment

procedures

contained

on

figure

15.

(Steps

5

and

6

adjustments

are

on

front

panel

,

figure

5.

)
ZZZZZ2ZZ

LD cn tn > > >

m m in

tn tn cn in

H-* o o O Q

> > - > > cn >>>inm Emincn

m in in — —

I ^ V m tn

f\j m tD oj m to z z z z z z

CL CL Q. £L CL 0.

ojfnio — — fT)rN.oDincnmv ^zzzzzzzzz

Q.CLQ.^Jjj_CLCLCLCLQ.Q.Q-CLQ.

'^nj(M0jf\jrurvi(\i0j(\j 555555535

30

Figure

17.

Normal

test

point

data.
(-nt LJ

31

Figure

18.

Typical

system

test

waveforms.
PIN

COL

RS5IGN

50

PIN D

CONN LDmm 00 n --

cn

Cn pj S — ^ ^ C\J

az I + 1 + 1 + X X > > hJ N z a h- l:) z X z z u z z z z z z z z o m z z

f\jm Ln LOX

LOXo

_J

_Jo

Ll.

LH

CE

CT

I—

CEU

CLU

CE

cnumo

CE_

CE

LJX

I—O zzou

Q_(S

LH

00

QXS(X)—'xnjcn zxm — ex — ex—' z

X”

(Z cn o u z Z 1

ou zo X“ u CE ua Z u o

_jou z Z z

1—(

D-S

in ZZ o

LJ> u om z ex 8 ^ az

t—t

a.Q S ^ X- i ^ o Z up CD

CLS Z Z z z z — —' Z p.^ Z QQ Z z z ' z ^ z z z z z ^ z o

ss

^zrv n

Q_ Z Z Z Z Z X

32

Figure

19.

Probe

color

code.
in

t-3

u

CQo

a

Q.UJu

z

crQ

u

d

5

QQQQQaOQ zzzzzzzz UCJOCJUOOL3 ^LOC£)r^a)cnS3 — nF)nr)rnn'^v

Q Q

z z d CJ

oj n

Q f\J V U3 CD Q OJ OJ'^CDQD^--*— ^^OJOJ + + + + + + + + + + + X>-NX>-NX>-NX>>

CDOTQ — OJnVLDCDNOD »--^OJOJOJOJOJ(\JOJOJOJ

-- ro ID XXNXXNXX 1 i ( I I I I ! — oJcn^inLor^cri

O) —

IS. ^ OJ

-- I I

I X X N

Q •- m — —

a

d n Q Q a

z z z z

cj (j cj G

in UD (D ^ V V 'T

<0- CD CD S

OJ OJ CM n

+ + + + N X >- N

O) s ^ fvi CM cn cn cn

CM

I X

cn

OJ

I N

in

CJZOJCJZOQCLZ

VLOCDf\-ODCnS'- rocncncnrncn-^v

— CM cn tr in CD

Q p

3 3

X X X X U U 5 c 2 g -* \ \ \ \ X X

:x: 3 X z p cn X m X m u

X \ \ \ \ p Q

\ p X 3 X in 3 X 2 ffl ffi 2 m

\ cn V in CD r>- CD

n- n- n- M- n- m Q

3 CM U V l-H T X X X X X X

X 2 2 2 2 2 tn

rs CD P p CM cn CM

1

CM CM p cn rn cn

1

1

1 P p

X X X X X 3

2 2 2 2 2 u U

\ \ \ \ \ \ P z X 3 J X X m X m o >- m in cn p — CM cn in (D

y y

o 2 0^ E 0- X

C

ifl

OJ T3 O

a

o

1—

I

o

o

0) Xi

n3 a

u

(U •H4h

•H

u

m \

p-i —I

Q. U

LJ UJ

OC ^ U1

tr a: t- CM S) X

cn in 5

I ^ GD O ^

X cn

Q_ ^ UJ

- cn Bq

I ^ X

U X z

<r ^

a

e

ci

g O CO

_l !-i 4-1 o

u CU c

0) o

z m 6

V4 c

p GO u

u 'H

UJ 4-1 CO X m CO

cO u

X

f- cJH

Ul

LO

O") C

m

TT -Ha

1 TTcn CD 0) (U

cn 4-) .-H tnz fS. 0)

t-4 cn B tcJ X a

X in o cn X o6

tt O S

in P r-t C/3

X o u 2 CN 5

X (U u u Ui

1—u Xo

3

60 X *H p~ Xa CJ-1

CO ^

33

J29 24PIN JUMPER BETVEEN BRCKPLRNES arm jltper between BKPL t 1^^TF

J26 DITTR ». PW JUMPER BETWEEN BKPL *. INTE J25 PM9 JUMPER BETVEEN EfiCKPLR^

CON 1-8 HS IN + 1 : HS IN GND

N/C

N/C N/C

N/C

HZ IN + HZ IN + N/C

N/C

HZ IN

HZ INN/C 15 N/C 16 N/C 17 N/C IB N/C 19 BUSY 20 N/C 21

START 47

OBI 48 TRK/HLD 49 DB0 50 +15V 51 +15V 52 GND 53 GND 54 -15V 55 -15V 5B OMD 57 GND 58 250KHZ SINE 59 250KHZ SINE 60

+ 15V M5V

GND -15V

-15V

GND

GND

250KHZ SINE

250KHZ SINE

J31 24PIN JUMPER BETWEEN BACKPU=INES

qQaoaaaaaaoPQb

J6 DATA JUTPER BETWEEN INTF 8. BKPL J2 DATA & PWR JIBBER

INTF i BKPL

Figure 21. Backplane schematic and connector chart [sheet 1 of 2].

35

PROBE

AMPLIFIER

CARD

Cl

OF

151 1 imj 8 HS IN + HS IN GND

N/C

N/C

N/C

N/C

HZ IN

+

HZ IN

+ N/C

N/C

N/C N/C

HZ IN -

HZ IN - N/C

N/C

N/C

N/C

N/C

BUSY

N/C

BdSV N/C

OVRG N/C

OBIS N/C

OBIl N/C DB10 N/C

DBS RB5

RB4 DB7

RB3

DB8 RB2

DBS

RBI

DB3 N^C

DBS STRRT

DBl TRK/H_D DB8 + 15V + 15V GND

GND -ISV

-15V

04D

GND

S50KHZ SINE

S50KHZ SINE

Figure 22 Backplane schematic and connector chart [sheet 2 of 2]

s-o

4-> 03C

bO

•1^ CO

(1) •o

CDOc

CD

5-

CD Cm

CDU

COCO

+j

CC3 OOc

CDCo

Cisoo

CDC

cc5 I—I

cxo

CC3 CD

c^

C\J

CDLD

bO

Cl-i

39

assignments] .
DRAWING

NO.

INTF0007

fn OJ s in a

O o o o o o z a a a a a Q

\ ^ Q in

40

Figure

24.

RF

probe

amplifier

interface
41

Figure

25.

Interface

component

locations

[reference

designator

assignments]

.
- d 9 i m

<D X)oo

t,o

rHooX3 fOo0) o

03

£-03 -PC

vO

CM

<UL3

bO

C3L|

42
22

OHM

Sy.

R3,

R5

MR4B83

100

OHM

TRIM

RQ

I-Pfl2800

OJ

Q

— (VI

m "T u)

aaaa

rvj 3« Q cvi tn

muQo

U1

u 10

:3 ,—i o 3 ¥

in

H . m in 3 3 3 3

U1 in in

m in

uX

uu

D 0. 1- _j

1- o o o

cn

u

n

a 13 IK 13

—• n

U 3 O

O

GD in in •—» in in (VJ CD in in

F inF «-• U in cn (VI G) (U G9 03 m in o o

fs. 0,

—«

IS in 1 (D (VJ

m CX3 in U)

XF 0.

F

tT IG

r 1 (VJ (VJ U- S3 C'-

Q IQ fS.

an z Z j r Q. 5 5

rJ

U Z s o P (VJ a. G) 0. I _i o IK F r w T o: IN- —• a —•

in

4-> m

to

4-> t,

03cx

u>

tVJ a:

inw

IK S - IK

toIK U)m - IK

CK •Tm - IK

ts. IK

(VJ IK

(S

(\J (s q:

in

IK - 01 $8¥

IK COm

IK

(DU

U)u

>*u

tnu

txj u

u

IS

(VJ u

(T) s • rn • u

m • (M (n in (\j fN- • cn U) CK CK CK CK u «-4 CD CK CK CK u u (VI u

(VJ cn in (VI • F • IN. CO (T (T3 CVJ • (VJ (n csT (VJ • (J • cn cn cn ro in (M (O (VJ cn (VJ (VI (VJ —• rvj (VI rvi — fN- CO in 0^ a: a: CK QC CK IK (K CK CK CK CK CK CK CK CK IK CK CK CK u u u u u m u m

IKo u > 5 u> u Z Z UfT u X _l o s. t z z H M n 1— M u o CL X z z •V .V n (-1 2 .V IK IK z N* LL u X u (T

F*

M F* IK -3 .V in

FF in X" » ff U.u h- .V «-4 F F o in o mm fV X F F 0 F E E z E E E E z E B U u X 0 0 u F UT" z X X E E E E E X X X X X X E u n u L. L. u 0 0 y y I r 0 E o X X X .J X X 0 0 0 -J 0 o X z l-l u u l. 1. o o o X X 0 o o UJ 0 UJ u. z •— E u U o :k 0 V y iC y Z y z &

li. E E IN- (M (M (VI in y. y (T :k y Q Gl G) G) Gl (VJ r (§ u. TT E E

(S 0) :k • S G) s CL G) in

Q S IS Gl CL (n • G)

Q

a S G)

G (M

—• n in—•

(VJ (VI

—• m—• —' m rg—•

in inm • • • (VI

Q.E

03

0) jOO

t, CL

inu h-

(M

in

(U

u

FD - bO

G) f-i U

Cxj

Uu

43
44

Figure

28.

Interface

parts

list.

Figure

29.

Backplane

parts

list

[connectors].
APPENDIX

Computer Program Listing

45
100 ! 102

104

106

108

110

112

114

116

IIB

120

122

124

126

128

130

132

134

136

138

140

142

144

146

148

150

152

154

156

158

160

162

164

166

168

170

172

174

176

178

180

182

184

186

188

190

192

194

196

198

200

202

204

206

208

210

212

214

216

218

RE—STORE "Probe_Sijbs"

! Original: 5 May 1984 G. Koepke (303) 497—5766

! Revision: 7 Nov 1985, 16:45

I

! Second generation probe so-ftware SUB programs.

! These SUBs allow any system size up to 48 probes

! and -for each antenna to have its' own amplitude and

! -frequency calibration data.

I

! Currently set to 15 channels for the NSWC system.

I OPTION BASE 1 DEG

PRINTER IS CRT

Di m_var i abl es: ! COM /Probe_system/ INTEGER Sys_size,TotaI_chans,Probe_addr (15,3)

COM /Probe_system/ INTEGER Top_probe,Fcal _pts,Pr_avgs

COM /Probe_system/ INTEGER Probe_vol ts ( 15) , Overrange ( 15)

COM /Probe_system/ INTEGER Probe_zero ( 15) ,REAL Probe_v_m ( 15)

COM /Probe_system/ REAL Ampl i tude_cal (5,3,5) ,Freq_cal (5,3,6,2)

COM /Probe_system/ REAL Readtime ( 15) ,Freq_crib (6,2)

COM /Interrupts/ INTEGER Intr_prty

COM /Bugs/ INTEGER Bugl ,Bug2,Bug3, Printer

COM /Files/ SourcediskSC203 ,0utdisk^C20D ,Fi Iename*C803

INTEGER Local _prty,P_sams,P

REAL Frequency

Intr_prty=5

Local _prty=5

Printer=701

Sourcedisk*=“: INTERNAL, 4,0"

Outdisk*=": I NTERNAL , 4 , 1

Bugs:

!

Bug 1=0

Bug2=l

Bug3=0

"XHP9133, 700,0’

CALL Mul ti probe_menu

P_sams=3

MAT Probe_volts= (100)

MAT Overrange= (O)

MAT Probe_zero= (0)

Frequency=300

CALL Apply_probe_cal (Frequency)

Set up the 15 probe system.

Read Multiprobe 3 times and average.

dummy data

dummy data

dummy data

dummy data

' Amplitude

actual sequence below

8t -frequency correction

STOP END test subs suggested sequence follows

Fill Probe_vol ts (-») using Probe_addr (•*) and Total _chans

IF Total_chans>0 THEN ! ZERO field offset reading (probe zero)

MAT Probe_zero= (O)

CALL Read_probes (@Gpi o)

MAT Probe_zero= Probe_volts

END IF

IF Total _chans>0 THEN ! Field applied, now read probes

CALL Read_probes (@Gpio)

Too_hot=0

FOR P=1 TO Total _chans

Too_hot=Too_hot OR Overrange(P) ! Test for overrange

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' NEXT P

' IF Too_hot THEN

' GOSUB Reduce_power

' GOTO Restart_poi nt

• END IF

! CALL AppI y_probG_cal (Frequency > ! Amplitude Sc -frequency correction

' END IF

END

I

I **********»***»*****•)«-«******•«•*»****«»**)«•*

I SUB Mul t i probe_menu

Mul t i probe_menu: !

! Provide a means of controlling the multi-probe system.

! The menu allows one to select the Amplifier channel and

! the probe connected to it.

! This information will be used to draw calibration data from

! the calibration matrix.

Variable and matrix index Definitions

Sys_size => Number of amplifiers in the system, this defines

menu limits so that one software package serves

systems of different sizes. (Bys_size = *)

Top_probe => The highest index for any probe in the system [<991

This index ties the calibration data to the antenna.

Whatever number of probes are used, the index numbers

must be sequential and tied to the calibration matrix

with values entered for them.

Total_chans => Number of amplifiers currently enabled by menu.

Probe_addr (, 3) => <-»,l)

(*, 2 ) (*,3)

Amplifier channel

Probe index number up to Top_probe

Probe channel 1=X, 2=Y, 3=Z, 4=Single

(4 is the same as 1 in drawing out the

calibration data)

Pr_avgs => The number of readings to be averaged together.

Probe_vol ts (•*) => Actual reading of A/D output.

0verrange(*) => Overrange flag for each channel

Readtime (•») => Conversion and read time of each channel.

Probe_zero (*) => Zero field offset reading

Probe_v_m (•*) => Final reading in Volts/meter.

Ampl i tude_cal (# probe, channel C 1-3D ,curvef it coef[l-51) => Amplitude calibration data: # probe = Top_probe

channels 1=X or S, 2=Y, 3=Z

curvefit coef 1= al (low)

2= bl (low)

3= a2 (high)

4= b2 (high)

5= low—high crossing

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Freq_cal (# probe , channel [ 1 -3D , CAL_pt , -freq CID or dB C2D) => Frequency calibration data: # probe and channels as above

CAL_pt= up to Fcal _pts as below

•freq or dB; 1= -frequency of cal

2= value dB at 1 Fcal_pts => Total number of calibration points in frequency

System_def ns: !

! xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx

! MULT I -PROBE SYSTEM DEFINITIONS

! xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx

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OPTION BASE 1 COM /Probe_system/ INTEGER Sys_si ze , Tot al _chans , Pr obe_addr ( 15 , 3)

COM /Probe_system/ INTEGER Top_probe,Fcal _pts,Pr_avgs

COM /Probe_system/ INTEGER Probe_vol ts ( 15) , Overrange ( 15)

COM /Probe_system/ INTEGER Probe_zero ( 15) ,REAL Probe_v_m ( 15)

COM /Probe_system/ REAL Ampl itude_cal (5,3,5) ,Freq_cal (5,3,6,2)

COM /Probe_system/ REAL Readtime ( 15) ,Freq_crib (6,2)

SYSTEM SIZE set here!!!

Set all matrix dimensions accordingly in

above COM statements,

return single sample per reading.

NOTE: Allow for three channels for every probe

even if there is a single channel.

You may, however, group several single

channel devices together under one index

number, (i.e. call first #25X, second one

#25Y, etc.). All probes in the system must

be numbered sequentially.

The calibration values are entered in the

sub called Probe_f i 1 1 _cal 1

.

! XXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXKXXXKXX

COM /Interrupts/ INTEGER Intr__prty

COM /Bugs/ INTEGER Bug 1 , Bug2, Bug3, Pr i nter

COM /Files/ Sourcedisk$I20D ,0utdisk#C20D ,Fi lename^CSOD

INTEGER I , J,K, Local _prty,Knobcnt_x ,Knobcnt_y,Selectpoint

INTEGER Dupl i cated , Test_si ze ,Pof f set ,Columnl ,Col umn2,Column3

INTEGER Interrupted

DIM Marker^CBD , Testae 160D

Local _prty=Intr_prty

DISP CHR$(128)

IF Bugl THEN

PRINTER IS Printer

PRINT TIME^ (TIMEDATE) ; "****** ENTER Mul ti probe_menu ******"

END IF

PRINTER IS CRT

GOSUB Print_bckgnd ! Print the heading and the amplifier channels.

60SUB Select_conf igur ! Select source of probe system configure.

!From disk, none or all probes.

GOSUB Conf i gure_probe !Select the amplifier and probe combination.

IF Bugl THEN

PRINTER IS Printer

PRINT TIME^ (TIMEDATE) ; "******** EXIT Mul t i probe_menu ********"

Sys_si ze=15

Top_probe=5

Fcal _pts=6

Pr_avgs=l

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PRINTER IS CRT

END IF

OUTPUT 2 USING iClear screen.

CALL Probe_f i 1 1 _cal ! Fill Ampl i tude_cal <*) and Freq_cal (*)

SUBEXIT

I

! ////////////////////////////////////////////////////////////

I Sel ect_conf i gur : OFF KEY

DISP SELECT SOURCE OF MULT I -PROBE CONFIGURATION " ON KEY O LABEL "NO PROBES" , Local _prty GOTO Noprobes

ON KEY 1 LABEL "ALL PROBES" , Local _prty GOTO All probes

ON KEY 5 LABEL "CUR SETUP" , Local _pr ty GOTO Con-f i g_sel ected

ON KEY 2 LABEL "FROM DISK" , Local _prty GOTO Diskin-fo

LOOP

END LOOP

Di skin-f o: GOSUB Read_probe_di sk

GOTO Con-f i g_sel ected

A1 1 probes: GOSUB Fi 1 1 _addresses

GOTO Conf i g_sel ected

Noprobes: Total _chans=0

MAT Probe_addr= (O)

Conf i g_sel ected: OFF KEY

DISP CHR*(12)

FOR I=Total _chans+l TO Sys_size

Probe_addr (1,1) =99

Probe_addr (1,2) =0

Probe_addr (1,3) =0

NEXT I RETURN

'//////////

Conf i gure_probe; ! GOSUB Print_probeaddr

Mar ker*= " === > " &RPT# ( CHR^ ( 8 ), 4

)

Knobcnt_x=0 ? move up and down columns

Knobcnt_y=0 ! move between rows.

Interrupted=l

Sel ectpoi nt=l

PRINT TABXYd ,Selectpoint+2) ;CHR*(128) ;MarkerS;

LOOP

IF Interrupted THEN

ON KNOB .05 GOSUB Movepointer

ON KEY 5 LABEL "ALL DONE" , Local _prty GOTO All conf iged

ON KEY O LABEL "CONFIG MENU" , Local _prty GOSUB Sourcemenu

ON KEY 1 LABEL "CHANGE PROBE" , Local _prty GOSUB Changeprobe

ON KEY 2 LABEL "ADD PROBE" , Local _prty GOSUB Addprobe

ON KEY 3 LABEL "READ DISK FILE", Local _prty GOSUB Read_disk

ON KEY 4 LABEL "SAVE ON DISK" , Local _prty GOSUB Saveondisk

ON KEY 7 LABEL "DELETE PROBE" ,Local_prty GOSUB Deleteprobe

ON KEY 9 LABEL "LIST ADDRS", Local _prty GOSUB Li st_addresses

DISP CHR^(129);" USE (shift) KNOB TO SELECT AMPLIFIER

DISP " and SOFTKEY TO SELECT ACTION. " Interrupted=0

END IF

END LOOP

A1 1 conf i ged : OFF KEY

OFF KNOB

DISP CHR$(12) fTurn off display enhancements

49
PRINT CHR$:(128)

RETURN

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////////////////////////////////////

i

Sourcemenu: ! Interrupted=l

Local _prty=Local _prty+l

G05UB Sel ect_conf i gur

GOSUB Pr i nt_probeaddr

GOSUB Reset_pointer

Local _prty=Local _prty-l

RETURN

Movepointer: ! Move selector on menu

Knobcnt_x=Knobcnt_x+KNOBX

Knobcnt_y=Knobcnt_y+KNOBY

IF ABS(Knobcnt_x)<5 AND ABS (Knobcnt_y )< 10 THEN RETURN

IF ABS<Knobcnt_x) >=5 THEN

Sel ectpoi nt=Sel ectpoi nt+SGN (Knobcnt_x

)

IF Selectpoint>Sys_size THEN Sel ectpoi nt=l

IF Sel ectpoi nt< 1 THEN Selectpoint=Sys_size

END IF

IF ABS(Knobcnt_y) >=10 THEN

SELECT Sel ectpoi nt

CASE 1 TO Columnl

IF SGN(Knobcnt_y) >0 THEN

IF Col umn2=Col umn 1 OR Sel ectpoi ntOCol umnl THEN

Sel ectpoi nt=Sel ectpoi nt+Col umn

1

END IF

END IF

CASE Columnl+1 TO Columnl+Column2

IF SGN(Knobcnt_y) >0 THEN

IF Col umn3=Col umn2 OR Sel ectpoi ntOCol umn l+Column2 THEN

Sel ectpoi nt=Sel ectpoi nt+Col umn2

END IF

END IF

IF SGN (Knobcnt_y )<0 THEN Selectpoint=Selectpoint-Columnl

CASE Coluflinl-*-Column2+l TO Sys_size

IF SGN (Knobcnt_y )<0 THEN Sel ectpoi nt=Sel ectpoi nt-Col umn2

END SELECT

END IF

Knobcnt_x=0

Knobcnt_y=0

OUTPUT 2;CHR#(255)8tCHR$(84) ;! Home the screen

PRINT CHR$:<128);

PRINT

GOSUB Reset_poi nter

PRINT Marker^;

RETURN

///////////////////, ///////////////////

Reset_poi nter : ! PRINT TABXYCl, 1>

;

SELECT Sel ectpoi nt

CASE 1 TO Columnl

PRINT TABXY (1, Sel ectpoi nt+2>

;

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CASE Columnl+1 TO Col umn2+Col umnl

PRINT TABXY (31 , Sel ec tpoi nt-Col umn 1 +2 )

;

CASE Col umn 1 --Col umn2+ 1 TO Sys_size

PRINT TABXY (61 , Sel ec tpoi nt-Col umn 1 -Col umn2-*-2) ; END SELECT

RETURN

! ////////////////////////////////////////////////////////////

I Posi ti on_pen; ! Set the pen to the probe # column.

PRINT TABXY ( 1, 1) ;CHR$:( 128) ; SELECT Selectpoint

CASE 1 TO Col umnl

PRINT TABXY(13,Selectpoint-^2) ;RPT«:(" ",8);

PRINT TABXY ( 13, Selectpoint-^2) ; CASE Columnl-t-1 TO Col umn 1 -*-Col umn2

PRINT TABXY (43, Selectpoint-Columnl-^2) ;RPT$:(" ",8)

PRINT TABXY (43, Selectpoint-Col umnl -^2) ; CASE Col umn l-*-Col umn2-»-l TO Sys_size

PRINT TABXY (73, Selectpoint-Col umn 1-Col umn2-^2) ;RPT#C‘ '',8);

PRINT TABXY ( 73 , Sel ectpoi nt-Col umn 1 -Col umn2-»-2) ; END SELECT

RETURN

//////////////////. '////////

Fi 1 1 _addresses: ! Put all probes into the ADDR matrix.

K-1

MAT Probe_addr= (0)

Total _chans=MIN (Sys_si ze , Top _probe*3)

FOR 1=1 TO Sys_size-2 STEP 3

FOR J=1 TO 3

IF I-^J-l<=Top_probe*3 THEN

Probe_addr (I+J-1 , 1)=I+J-1

Probe_addr ( I-*-J-l ,2) =K

Probe_addr ( I-*-J-l , 3) =J

ELSE

Probe_addr ( I-^J-l , 1 ) =99

Pr obe_addr ( I+J-1 ,2) =0

Probe_addr ( I+J-1 , 3) =0

END IF

NEXT J

K=K+1

NEXT I RETURN

////////////////////////////////////////////////////////////

Pr i nt_bckgnd : !

I Set up the menu limits and column length.

Columnl= (Sys_size DIV 3) +MIN (Sys_si ze MODULO 3,1)

Column2= (Sys_size DIV 3) +MAX (MIN ( (Sys_si ze MODULO 3)-l,l),0)

Col umn3=Sys_si ze DIV 3

I OUTPUT 2 USING "K , #" ; "KT"

PRINT TABXY(1,1) ;CHR*(132) ; RPT^ ( " >" , 26) ; PRINT •• MULT I -PROBE CONFIGURATION "

; RPT» ( "< "

, 26)

PRINT TABXYd ,2) ;CHR»(129) ; Ampl i -f i er-Probe #

" PRINT TABXY (31 ,2) ; " Ampl i t i er-Probe #

” PRINT TABXY(61 ,2) ; Ampl i t i er-Probe #

"

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PRINT CHR^(128)

FOR 1=1 TO Columnl

PRINT TABXY (5, 1+2)

;

PRINT USING "MDD,#";!

PRINT •• NEXT I FOR 1=1 TO Column2

PRINT TABXY (35, 1+2)

;

PRINT USING "MDD,#"; I+Columnl

PRINT " •' NEXT I FOR 1=1 TO Column3

PRINT TABXY(65, 1+2)

;

PRINT USING "MDD,#''; I+Columnl+Column2

PRINT ’ " NEXT I RETURN

’///////////////////////////////////

Pr i nt_probeaddr : ! PRINT TABXY (1, 1 ) ;CHR«(128)

;

J=1

FOR 1=1 TO Columnl

PRINT TABXY(13,I+2) ;RPT»(" ",8);

PRINT TABXY(13,I+2)

;

IF Probe_addr(J,l)=I THEN

GOSUB Single write

J=J+1

ELSE

PRINT "Not Used”

END IF

NEXT I FOR 1=1 TO Column2

PRINT TABXY (43, 1+2) ;RPT#(" ”,8)

PRINT TABXY (43, 1+2)

;

IF Pr obe_addr (J , 1

) =I+Columnl THEN

GOSUB Single_write

J=J+1

ELSE

PRINT "Not Used"

END IF

NEXT I FOR 1=1 TO Column3

PRINT TABXY (73, 1+2) ;RPT*(" ",8);

PRINT TABXY (73, 1+2)

;

IF Probe_addr ( J , 1 ) =I+Col umn 1+Col umn2 THEN

GOSUB Single_write

J=J + 1 ELSE

PRINT "Not Used"

END IF

NEXT I RETURN

! ////////////////////////////////////////////////////////////

I Si ngl e_wri te: ! PRINT USING "DD,X,#";Probe_addr (J,2)

SELECT Probe_addr (J,3)

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CASE 1 PRINT * CASE 2

PRINT "Y"

CASE 3

PRINT "Z"

CASE 4

PRINT "Sngl"

CASE ELSE

PRINT "ERROR"

END SELECT

RETURN

I

I ////////////////////////////////////////////////////////////

I Addprobe: ! Interrijpted=l

IF Total _chans=Sys_si ze THEN

DISP " THERE IS A PROBE FOR EACH AMPLIFIER ALREADY " BEEP

WAIT 1.8

DISP CHR*(12)

RETURN

END IF

FOR 1=1 TO Total _chans

IF Probe_addr ( I , 1 > =Sel ectpoi nt THEN

DISP " THIS CHANNEL IS ALREADY ACTIVE " BEEP

WAIT 1.8

DISP CHR^(12)

RETURN

IF

chans+1

<X,Y,Z, or Single (S) ",Testf^

END

NEXT I IF Total _chans<Sys_size THEN Total _chans=Total

_

Probe_addr (Total _chans , 1

) =Sel ectpoi nt

Enterprobnum:

!

DISP "ENTER the index number -for the probe

LINPUT Test*

ON ERROR GOTO Enterprobnum

Probe_addr (TotaI_chans,2) =VAL (Test*)

OFF ERROR

IF Probe_addr (Total_chans,2) >MIN (Top_probe,99) THEN Enterprobnum

IF Probe_addr (TotaI_chans,2> < 1 THEN Enterprobnum

Enterprobax i s:

!

LINPUT " ENTER THE ANTENNA AXIS

SELECT UPC* ( Test* C 1,11)

CASE "X"

Probe_addr (Total _chans , 3) =1

CASE "Y"

Probe_addr (Total _chans , 3) =2

CASE "Z"

Probe_addr (Total_chans,3) =3

CASE "S"

Probe_addr (Total_chans,3) =4

CASE ELSE

Probe_addr (Total_chans,3) =99

GOTO Enterprobax i

s

END SELECT

PRINT CHR*(128);

GOSUB Alreadyacti ve

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IF Duplicated THEN

Probe_addr (Total _chans , 1

) =99

Probe_addr (Total _chans ,2) =0

Probe_addr (Total_chans,3) =0

Total _chans=Total _chans—

1

DISP THIS PROBE IS ALREADY ACTIVE “ BEEP

WAIT 1.8

DISP CHR#(12)

RETURN

END IF

GOSUB Posit ion_pen

J=Total _chans

GOSUB Single_write

GOSUB Reset _pointer

MAT SORT Probe_addr (*, 1)

RETURN

//////,

A1 readyact i ve: ! Test -for this probe already existing in the matrix.

Dup I i cated=0

FOR 1=1 TO Total _chans-l

IF Probe_addr ( I ,2) =Probe_addr (Total _chans,2) THEN

IF Probe_addr ( I ,3) =Probe_addr (Total_chans,3) THEN

Dupl icated=l

END IF

END IF

NEXT I RETURN

Changeprobe: ! GOSUB Deleteprobe

GOSUB Addprobe

RETURN

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Deleteprobe:

!

Interrupted=l

!Find the amplifier channel

FOR 1=1 TO Total _chans

IF Probe_addr ( I , 1 ) =Sel ectpoi nt THEN

Probe_addr (1,1) =99

Probe_addr (1,2) =0

Probe_addr (1,3) =0

Total _chans=Total _chans-l

END IF

NEXT I GOSUB Position_pen

PRINT "Not Used";

GOSUB Reset_pointer

MAT SORT Probe_addr (*, 1)

RETURN

Read disk:

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Inter rup ted =1

GDSUB Read_probe_di sk

G05UB Pri nt_probeaddr

GDSUB Reset_poi nter

RETURN

I

' ////////////////////////////////////////////////////////////

I Read_probe_di sk :

!

DISP " NOW READING IN THE PROBE CONFIGURATION FROM DISK " ON ERROR CALL Errortrap

ASSIGN 0Datapath TO "Probe_cntg "StSourcedi sk^

ENTER ©Datapath; Test_size

IF Test_size< >Sys_si ze THEN

BEEP

DISP " FILE is for system size of “ ; Test_si ze; " , the active"

DISP " system is ";Sys_size

PAUSE

GOTO File_error

END IF

ENTER ©Datapath; Total _chans

ENTER ©Datapath; Probe_addr (*)

File_error: ! ASSIGN ©Datapath TO * OFF ERROR

WAIT 1 DISP CHR*(12)

RETURN

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'/////

Saveondi sk :

!

Interrupted=l

DISP •• SAVING THE PROBE CONFIGURATION ON DISK " ON ERROR GOTO Cannotcreate

CREATE BDAT "Probe_cnf g"&Sourcedisk^,5,256

GOTO Creati on_done

Cannotcreate: IF ERRN054 THEN

CALL Errortrap

GOTO Saveondi sk

END IF

Creati on_done: OFF ERROR N ERROR CALL Errortrap

ASSIGN ©Datapath TO "Probe_cnf g"&Sourcedisk$

OUTPUT ©Datapath; Sys_size

OUTPUT ©Datapath ; Total _chans

OUTPUT ©Datapath; Probe_addr (*)

ASSIGN ©Datapath TO * OFF ERROR

WAIT 1 DISP CHR^(12>

RETURN

'////////////////////

Li st_addresses:

!

Interrupted=l

PRINTER IS Printer

PRINT RPT4 (•*", 80)

PRINT "TOTAL CHANNELS ENABLED ="; Total _chans;

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PRINT ", System Size =";Sys_size

PRINT

Imagine: IMAGE M3D," '•,M3D," ",6A,#

IF INT(Sys_size/2)=Sys_size/2 THEN

Po-f -f set = INT <Sys_size/2)

ELSE

Po-ff set=INT (Sys_size/2) +1

END IF

PRINT Amp# Probe# Channel#";

PRINT TAB(40);" Amp# Probe# Channel#"

FDR 1 = 1 TO Pof-fset

J=Probe_addr (1,1)

K=Probe_addr (I ,2)

SELECT Probe_addr (I ,3)

CASE 1 Test4="X"

CASE 2

Test^="Y"

CASE 3

Test^="Z"

CASE 4

Test4="Singl e"

CASE ELSE

Test ='• ERROR"

END SELECT

IF J099 THEN

PRINT USING Imagine; J,K, Test#

ELSE

PRINT " ** end of file.";

GOTO Done

END IF

IF I+Poffset<=Sys_size THEN

J=Probe_addr ( I+Pof f set , 1

)

K=Probe_addr ( I+Pof f set ,2)

SELECT Probe_addr (I+Pof fset ,3)

CASE 1 Test#="X"

CASE 2

Test#="Y"

CASE 3

Test#="Z"

CASE 4

Test#="Single"

CASE ELSE

Test#=" ERROR"

END SELECT

IF J099 THEN

PRINT TAB (40);

PRINT USING Imagine; J,K, Test#

ELSE

PRINT TAB(42)

;

END IF

END IF

PRINT

NEXT I Done: PRINT USING "5/"

PRINTER IS CRT

RETURN

I

I

56
SUBEND

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h**************************************************

SUB Read_probes (eSpi o)

Read_probes:

!

OPTION BASE 1 COM /Probe_system/ INTEGER

COM /Probe_system/ INTEGER

COM /Probe_system/ INTEGER

COM /Probe_system/ INTEGER

COM /Probe_system/ REAL

COM /Probe_system/ REAL

COM /Bugs/ INTEGER

COM

Sys_si ze , Total _ch an s , Probe_addr (•*) Top _probe , Fcal _pts , Pr_avgs

Probe_vol ts (*) , Overrange (*)

Probe_zero () ,REAL Probe_v_ra ()

Ampl i tude_cal (*) ,Freq_cal (*)

Readtime(*) ,Freq_crib (*)

Bugl , Bug2 , Bug3 , Pr i nter

/Interrupts/ INTEGER Intr_prty

INTEGER I ,P,Eir ,Eir_bi t ,Readone,CtlO,Ctl

1

INTEGER Power_of-f ,Signbit

ALLOCATE INTEGER Over_f 1 ag (Total _chans)

ALLOCATE REAL Probe ave (Total chans)

IF Bugl OR Bug2 THEN PRINTER IS Printer

IF Bugl THEN

PRINT TIME<: (TIMEDATE) ; " **** ENTER Read_probes ******'’

END IF

IIF Pr_avgs<l THEN Pr_avgs=l

MAT Probe_ave= (0. ) MAT Over_-flag= (0)

MAT Probe_volts= (0)

FOR 1=1 TO Pr_avgs

G05UB Read_all _probes

FOR P=1 TO Total _chans

Probe_ave (P) =Probe_ave (P) +Probe_vol ts (P)

Over_-f 1 ag (P) =0ver_-f 1 ag (P) OR Overrange(P)

NEXT P

NEXT I FOR P=1 TO Total _chans

Probe_vol ts (P) =INT (Probe_ave (P) /Pr_avgs)

Overrange (P) =Over_t lag (P)

NEXT P

IF Bugl THEN

PRINT TIME$ (TIMEDATE) ; ******* EXIT Read_probes ********"

END IF

IF Bugl OR Bug2 THEN PRINTER IS CRT

DEALLOCATE Probe_ave(*) , Over_f 1 ag (*)

SUBEXIT

///////////////////////////////////

Read_al 1 _probes:

!

MAT Readtime= (O.

)

MAT Probe_volts= (O)

MAT Overrange= (0)

IF Total _chans<l THEN RETURN

S

! SET Addr 1 and Check -for power on at Probes via PFLG.

CONTROL 12, 3; Pr obe_addr (1 , 1)

STATUS 12,4; Power_off

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IF Power _oFf THEN

DISP CHR$(129)

DIBP “The Power to Multi-probe is o-f -f .... correct it.";

DISP CHR^(128)

BEEP

PAUSE

DISP CHR«:(12)

END IF

Initialize Track/Hold to TRACK with Start line low.

CONTROL 12,1;1

CtlO=l

Ctl 1=1

CONTROL 12,2; CtlO+Ctl 1*2

SET PCTL.

SET. (START PULSE low)

set (low. ... Track)

Send values out.

IF Bug3 THEN PRINT "SETTING CTLO, CTLl to INITIAL CONDITIONS."

Track signal

Ctl 0=1

Ctl 1=1

CONTROL 12,2; CtlO+Ctl 1*2

WAIT .01

BET. (START PULSE low)

set (low. ... Track)

Send values out

Allow tracking for .01 sec. Hold signal (only has meaning when High-Speed input enabled.)

Set (START PULSE low)

clear (hi gh . . . . Hoi d)

Send values out

Begin start pulse.

CtlO=l

Ctl 1=0

CONTROL 12.2; CtlO+Ctl 1*2

IF Bug3

Ctl 0=0

Ctl 1=0

CONTROL

Ctl0=l

Ctl 1=0

CONTROL

THEN PRINT "SEND TRIGGER PULSE"

! CLEAR (START PULSE HIGH)

! Keep on HOLD.

12 , 2; Ctl 0+Ctl 1*2 ! Send values out.

! SET (START PULSE LOW)

! SET TO HOLD.

12,2; CtlO+Ctl 1*2 ! Send values out.

Check EIR bit low (BUSY is high) to insure the A/D is working.

STATUS 12,5;Eir

Eir_bit=BIT(Eir,2)

IF Eir_bit THEN

DISP "A/D not responding to START pul se. ... Check conditions.

BEEP

PAUSE

END IF

! Set up interrupt and wait for BUSY to go low.

! Address is set to first Probe address already

ON INTR 12,15 GOTO Conti nue_reads

ENABLE INTR 12; 1 IF Bug3 THEN PRINT TABXY ( 1 , 18) ; "WAITING FOR DATA READY"

DISP CHR^(12)

Bigtime=TIMEDATE

P=1

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LOOP

IF TIMEDATE-Bigtime>l .5 THEN GOBUB Interf ace_dead

END LOOP

Conti nLie_reads: ! Interrupt detected ... read channel 1 STATUS 12,3;Probe_volts(l)

Si gnbi t=BIT (Probe_vol ts ( 1 ) ,12)

Probe_vol t s ( 1 ) =BINAND (Probe_vol ts ( 1 ) , 4095)

IF Signbit=l THEN Probe_vol ts ( 1

) =Probe_vol ts ( 1

) -4096

STATUS 12, 5; Overrange ( 1

)

Overrange ( 1 ) =BIT (Overrange ( 1 ) ,3)

Readtime (1 ) =TIMEDATE-Bi gt i me

FOR P=2 TO Total _chans

CONTROL 12,3;Probe_addr (P, 1)

I

! Check EIR bit high (BUSY is 1 ow) .... ready to read

I Bi g t i me2=T I MEDATE

LOOP

STATUS 12,5;Eir

Eir_bit=BIT(Eir ,2)

EXIT IF Eir_bit

IF TIMEDATE-Bigtime2>1.5 THEN GOBUB Interf ace_dead

END LOOP

STATUS 12,3;Probe_volts(P)

Si gnbi t=BIT (Probe_vol ts(P) ,12)

Pr obe_vol ts (P) =BINAND (Probe_vol ts (P) ,4095)

IF Signbit=l THEN Probe_vol ts (P) =Probe_vol ts (P) -4096

STATUS 12 , 5; Overrange (P)

Overrange (P) =BIT (Overrange (P) ,3)

Readtime (P)=TIMEDATE-Bigtime

NEXT P

! CONTROL 12,3; Probe_addr ( 1, 1 ) ! Reset to channel 1 ??

I

! Reset Track/Hold to TRACK with Start line low.

I CtlO=l f SET. (START PULSE low)

Ctl 1 = 1 ! set ( 1 ow. ... Track

)

CONTROL 12,2; Ctl 0+Ctl 1*2 ! Send values out.

RETURN

I

! ////////////////////////////////////////////////////////////

I Interf ace_dead:

!

DISP CHR*(129)

DISP " NO RESPONSE from channel " ; Probe_addr (P , 1 ) ; " ! "; DISP CHR^(128>

BEEP

WAIT 1.8

DISP CHR*(12)

Bi gtime=TIMEDATE

RETURN

I

! ////////////////////////////////////////////////////////////

I SUBEND

I

I SUB Probe_f ill_cal

Probe fill cal :

!

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Fill the probe calibration matrix with values

OPTION BASE 1 COM /Pr obe_system/

COM /Probe_system/

COM /Probe_system/

COM /Probe_system/

COM /Probe_system/

COM /Probe_5ystem/

INTEGER I,J,K

INTEGER Sys_si ze , Total _chans ,Probe_addr (*)

INTEGER Top_probe ,Fcal__pts, Pr_avgs

INTEGER Probe_vol ts (*) , Overrange (*)

INTEGER Probe_zero (*) ,REAL Probe_v_m(*)

REAL AmpI i tude_cal (*) ,Freq_cal (*)

REAL Readt i me ( * ) , Freq_cr i b (*)

IF Bugl OR Bug2 THEN PRINTER IS Printer

IF Bugl THEN

PRINT TIME^(TIMEDATE) ; " ******* ENTER Pr obe_-f i 1 1 _cal ********

END IF

DISP " Filling Amplitude calibration array. " Cal i b_curvef i t : !

! -fit to Field (V/m)= a(Decimal output)^b

! where al,bl is -for <low-high crossing

! and a2,b2 is -for >=low-high crossing

RESTORE Cal i b_curvet i t

! al bl a2 b2 low—high crossing

DATA 4. 751 15,. 554942, 1.67252,. 755931, 175 ! IX

DATA 4. 21950,. 562912, 1.51002,. 760065, 189 ! lY

DATA 3. 80279,. 591 157, 1.63280,. 751374, 200 ! IZ

DATA 4. 13591 ,.578563, 1.65858,. 755074, 170 ! 2X

DATA 4.09156,.568407, 1.50863,. 76030 1,180 ! 2Y

DATA 3. 90861,. 579 196, 1.53843,. 757005, 180 ! 2Z

I DATA 4. 77555,. 570532, 1.88350,. 75 1508, 190 ! 3X

data 4. 48032,. 550087, 1.47673,. 763525, 170 ! 3Y

DATA 4. 42092,. 556629, 1.55505,. 759 144, 175 ! 3Z

DATA 4. 70342, .542879, 1.61699, .749880, 175 ! 4X

data 4.42551 , .554332, 1.54252, .757989, 180 ! 4Y

DATA 4. 35856,. 55857 1,1. 54460,. 759468, 175 ! 4Z

DATA 3. 67584,. 578890, 1.39243,. 763700, 190 ! 5X

DATA 4. 36056,. 548574, 1.40885,. 766072, 175 ! 5Y

DATA 4. 21723, .559496, 1.49515, .759377, 180 ! 5Z

I FOR 1 = 1 TO Top__probe

FOR J=1 TO 3 ! 3 channels; x,y,z or s,0,0

FOR K=1 TO 5 ! al ,b 1 , a2 ,b2, 1 -h crossing

READ Amplitude_cal (I ,J,K)

NEXT K

NEXT J

NEXT I WAIT 1

!Fill Frequency response data

I Freq_cal data:

!

DISP " Filling Frequency calibration array. " RESTORE Freq_caldata

DATA 300, 1,500,. 894, 1000,. 689, 2000,. 825, 5000,. 820, 8000,. 857 ! 1-X

DATA 300, 1,500,. 898, 1000,. 702, 2000,. 860, 5000,. 874, 8000,. 941 ! 1-Y

DATA 300, 1,500,. 900, 1000,. 687, 2000,. 814, 5000,. 796, 8000,. 835 ! 1-Z

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DATA 300 , 1, 500 ,.916,1 000 , . 673 , 2000 , . 783 , 5000 ,.715, 8000 , . 740

DATA 300 , 1 , 500 ,.915,1 000 , . 680 , 2000 , . 796 , 5000 , . 733 , 8000 , . 740

DATA 300 , 1, 500 , . 908 , 1 000 , . 664 , 2000 , . 779 , 5000 ,.712, 8000 , . 726

I DATA 300 , 1

, 500 , . 900 , 1 000 , . 682 , 2000 , . 749 , 5000 , . 783 , 8000 , . 829

DATA 300,1,500,. 921 , 1000, . 706,2000, . 750 , 5000 ,. 793 , 8000 , . 852

DATA 300 , 1, 500 ,.913,1 000 , . 690 , 2000 , . 745 , 5000 , . 746 , 8000 , . 776

I DATA 300, 1,500,. 888, 1000,. 698, 2000,. 807, 5000,. 731, 8000,. 757 ' 4-X

DATA 300, 1 ,500, .866, 1000, .684,2000, .801 ,5000, .753,8000, .803 ! 4-Y

DATA 300, 1,500, .883, 1000, .700, 2000, .802, 5000, .755, 8000, .813 ! 4-Z

I DATA 300,1 ,500, .908, 1000, .714, 2000, .830, 5000, .710, 8000, .718 ! 5-X

DATA 300, 1,500,. 917, 1000,. 713, 2000,. 823, 5000,. 755, 8000,. 803 ! 5-Y

DATA 300,1 ,500, .922, 1000, .720, 2000, .819, 5000, .716, 8000, .742 ! 5-Z

I FOR 1 = 1 TO Top _probe

FOR J=1 TO 3 ! 3 channels; x,y,z or s,0,0

FOR K=1 TO Fcal_pts ! The -frequencies where cal is done

READ Freq_cal (I,J,K,1) , Freq_cal ( I

, J , K , 2)

NEXT K

NEXT J

NEXT I IF Bugl THEN

PRINT TIME$ (TIMEDATE) ; "  -«-**  EXIT Probe_f i 1 1 _cal *****"

END IF

IF Bugl OR Bug2 THEN PRINTER IS CRT

DISP CHR«:(12)

SUBEXIT

SUBEND

I

I SUB Appl y_probe_cal (REAL Frequency)

Appl y_probe_cal : ! Convert the decimal A/D output to V/m

OPTION BASE 1 COM /Probe_system/ INTEGER Sys_size,Total_chans,Probe_addr (*)

COM /Probe_system/ INTEGER Top_probe , Fcal _pts , Pr_avgs

COM /Probe_system/ INTEGER Probe_vol ts (*), Overrange (•») COM /Probe_system/ INTEGER Probe_zero (*) ,REAL Probe_v_m(*)

COM /Pr obe_system/ REAL Ampl i tude_cal (*> ,Freq_cal (»)

COM /Pr obe_system/ REAL Readt i me (») , Freq_cr i b (>

COM /Bugs/ INTEGER Bug 1

, Bug2 , Bug3 , Pr i nter

INTEGER I , J ,K,L,M, Amp , Probe, Zer , A_d ,Org , Nogood

REAL A,B,V_m,Fcal ,Lhc

DIM Ax^ClI

! IF Bugl OR Bug2 THEN PRINTER IS Printer

IF Bugl THEN

PRINT TIME^ (TIMEDATE) ; " •»****»* ENTER Appl y_probe_cal ****»**•"

END IF

IF Bug2 THEN ! Tabulate the numbers, print heading.

PRINT RPT$("_",80)

PRINT "Frequency=" ; Frequency

PRINT "Amp# Probe# Axis Zero A/D Ovrng? a (aX'b) b";

PRINT " Fcal => Volts/mtr"

END IF

I

! Subtract the zero -Field o-ffset.

61

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r-4 N

K)n
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MAT Probe_volts= Probe_vol ts—Probe_zero

FDR 1=1 TO Total _chans

! Determine probe index pointers.

J=Probe_addr ( I ,2) ! Probe index number

K=Pr obe_addr ( I , 3) ! channel index number

IF K>3 THEN K=1 ! Single channel uses slot 1.

I

! GET AMPLITUDE calibration curvefit coefficients.

Appl y_am_cal :

'

! Ampl i tude_cal ( J

,5) =Low-hi gh crossing value for curvefit coef

.

IF Probe_volts(I) >=Amplitude_cal (J,K,5) THEN

!select high range coef.

L=3

M=4

ELSE

! select low range coef.

L=1

M=2

END IF

A=Ampl i tude_cal (J,K,L)

B=Ampl i tude_cal (J,K,M)

Appl y_f r_cal : !

! GET frequency calibration data.

! Copy this channel's frequency cal data into Freq_crib(*)

FDR L=1 TO Fcal _pts

Freq_crib (L, 1 ) =Freq_cal (J,KfL,l)

Freq_cr i b (L , 2) =Freq_cal (J,K,L,2>

NEXT L

CALL Get_cal _val ue (Frequency , Fcal ,Freq_cr i b (*) , Nogood ,Fcal _pts)

I

! SOCK it to the A/D output ... convert to Volts/meter?

•IF Probe_vol ts ( I )<0 THEN Probe_vol ts (I ) =0

Probe_v_m ( I ) = (A* (Probe_vol ts ( I )

) "B) *Fcal

IIF Bug2 THEN

Amp=Probe_addr (1,1)

Probe=Probe_addr (1,2)

SELECT Probe_addr (I ,3)

CASE 1 Ax^="X"

CASE 2

Ax*="Y"

CASE 3

Ax^="Z"

CASE 4

Ax*='*S"

CASE ELSE

Ax»="E"

END SELECT

0rg=Dverrange ( I

)

Zer=Probe_zero ( I

)

A_d=Probe_vol ts ( I

)

V_m=Probe_v_m ( I

)

Imagel: IMAGE M3D,2X ,M3D ,3X , A, 3X ,2 (M4D, 2X ) ,MDD,2X ,3 (MD. 6D , 2X ) ,M4D.2D

PRINT USING Imagel ; Amp

,

Probe, Axif, Zer

,

A_d ,Org , A, B, Fcal , V_m

END IF

NEXT I IF Bug2 THEN PRINT RPT^ ( •'_" ,80)

IF Bugl THEN

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PRINT TIME$: (TIMEDATE)

;

" ***

EXIT Appl y_probe_cal  "

END IF

IF Bugl OR Bug2 THEN PRINTER IS CRT

SUBEXIT

SUBEND

I

I SUB Get_cal _val ue (REAL Target , Resul t , Fi 1 e (»>, INTEGER Baddata , Endpoi nt

)

I

! Original: 17 Jan 1984, by G. Koepke and Darlene Agee

' Revision: 26 Sep 1985, by G. Koepke

I

! This routine will search the matrix o-f data using the binary-

' search method until the desired X value is bracketed. Using

! the bracket values -for Y the resulting Y value For the desired

! X value is found by linear i nterpol at i on

.

I

! Tar get=desi red X as given during CALL.

! X_low=Low value of X used during binary search

! X_high=High "

! I_low=Index of 1 ow X

"

! I_high=Index of High X

" " " "

! I_cntr=Index of half way point.

I OPTION BASE 1 COM /Bugs/ INTEGER Bug 1

, Bug2 , Bug3 , Pri nter

REAL X_low,Y_low,X_high,Y_high

INTEGER I_low, I_high, I_cntr , Target_f ound

IIF Bugl THEN

PRINT TIME^(TIMEDATE)

;

PRINT

"** * Begin Search for X="; Target;" in File

***"

END IF

GOSUB Check_endpts

IF Baddata OR Target_found THEN Bo_home

GOSUB Search_file

GOSUB Interpolate

Go_home: ! IF Bugl THEN

PRINT TIME$ (TIMEDATE)

;

PRINT "***** End Search, returning Y=";Result;"

***"

END IF

SUBEXIT

'///////////

Check_endpts : !Check condition of file and verify Target is in range.

Target_f ound=0

Baddata=0

Resul t=0

IF Endpoint>0 THEN

IF Target<Fi 1 e ( 1

, 1 ) OR Target >Fi 1 e (Endpoi nt , 1 ) THEN

Baddata=l

Resul t=l .

0

IF Bugl THEN

PRINT "Desired X—value outside range of data.";

PRINT " Returning Y-value of 1.0

***"

PRINT "Range="; File (1,1) ; " to Fi 1 e (Endpoi nt , 1 )

;

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PRINT Desired val ue=" ; Target

END IF

ELSE

IF Endpoint<2 AND Target=Fi 1 e ( 1 , 1 ) THEN !0nly one data point

Resul t=Fi le ( 1 ,2)

Target_f ound=l

END IF

END IF

ELSE

Baddata=l

Result = l . 0

IF Bugl THEN

PRINT "This file is empty!

PRINT " Returning Y-value of 1.0 **********"

END IF

END IF

RETURN

Search_file: ! Target exists within X_low to X_high

! and file has at least two entries.

I I_1 ow=l

I_hi gh=Endpoi nt

I_cntr=INT( (I_high-I_low) /2)+I_low

X_1 ow=F i 1 e ( I _1 ow , 1

)

X_hi gh=Fi 1 e < I_hi gh , 1

)

IF Bug3 THEN

PRINT " Searching for Tar get;" " 60SUB Trace_search

END IF

IF ( I_cntr=I_l ow) OR (Target=X_l ow) OR (Target=X_high) THEN Bullseye

REPEAT

IF Target >=Fi 1 B ( I_cntr , 1 ) THEN

I_1 ow=I_cntr

X_1 ow=File(I_low, 1)

ELSE

I_high=I_cntr

X_hi gh=Fi le(I_high, 1)

END IF

I_cntr=INT( (I_high-I_l ow) /2)+I_l ow

IF Bug3 THEN GOSUB Trace_search

UNTIL (I_cntr=I_low) OR (Target=X_l ow) OR (Target=X_hi gh

)

Bui 1 seye:

!

IF Bug3 THEN PRINT " Search ended. " RETURN

Trace_search: ! Print search parameters as they change.

PRINT "Low I,X=";I_low;",";X_low;

PRINT High I , X=" ; I_hi gh; "

, " ; X_hi gh;

PRINT Center I , X=" ; I_cntr ; "

, " ; Fi 1 e ( I_cntr , 1

)

RETURN

Interpolate:

!

Y_1 ow=Fi 1 e ( I _1 ow , 2

)

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Y_hi gh=F i 1 e ( I_hi gh ,2)

I IF ABS(X_high-X_low) M.OE-10 THEN ! Not same X value

Resul t= ( ( Y_hi gh-Y_l ow) / ( X_hi gh-X_l ow) ) * (Target—X_1 ow) +Y_1 ow

ELSE

Resul t= ( Y_hi gh+Y_l ow) /2

END IF

IIF Bug3 THEN PRINT "Desired f req Target ;

VALUE=" ; Resul

t

'Resul t=10. " (Result/10)

!IF Bug3 THEN PRINT "Desired -f req. ="; Target ; " RATI0=" ; Resul t

RETURN

SUBEND

I

I SUB Errortrap

!Trap disk errors here

I COM /Files/ Disking, Diskout$,Filename$

BEEP 400,.

6

SELECT ERRN

CASE 54

DISP "DUPLICATE FILE NAME: " ; Fi 1 ename<:;

DISP " PURGE old one? (Y/N)";

INPUT Test$

SELECT Tested, ID

CASE "Y","y"

PURGE Fi lename^&Diskout#

CASE ELSE

DISP "ENTER NEW FILE NAME";

LINPUT Fil enamel

END SELECT

CASE 52,53

DISP "Improper FILE NAME ENTER NEW FILE NAME";

OUTPUT 2 USING "K Fi

1

enamel

LINPUT Filename#

CASE 64

DISP "This disk is -full, PLEASE insert clean disk"

PAUSE

CASE 80

DISP "CHECK DISK drive door! "; DISP " ...CONTINUE when ready"

PAUSE

CASE ELSE

DISP ERRM#;" 'CONTINUE' when fixed"

PAUSE

END SELECT

DISP CHR#(12)

SUBEXIT

SUBEND

65
NBS-114A iREv. 2 -e U.S. DEPT. OF COMM.

BIBLIOGRAPHIC DATA

1. PUBLICATION OR

REPORT NO.

2. Performing Organ. Report No. 3. PubI ication Date

SHEET (See instructions) NBSIR R6-3n5R October 1986

4. TITLE AND SUBTITLE

HANDBOOK FOR OPERATION AND MAINTENANCE OF AN NBS MULTISENSOR AUTOMATED EM FIELD

MEASUREMENT SYSTEM

5. AuThOR(S)

W. D. Bensema, G. H. Koepke, H. W. Medley

6. PERFORMING ORGANIZATION (If joint or other than NBS, see in struction s)

NATIONAL BUREAU OF STANDARDS

DEPARTMENT OF COMMERCE

WASHINGTON, D.C. 20234

7. Contract/Grant No.

8 . Type of Report & Period Covered

9. SPONSORING ORGANIZATION NAME AND COMPLETE ADDRESS (Street. City. State. ZIP)

10. SUPPLEMENTARY NOTES

Q2] Document describes a computer program; SF-185, FIPS Software Summary, is attached.

11. ABSTRACT (A 200-word or less factual summary of most significant information. If document includes a signif- "—

>

bi bl iography or literature survey, mention it here)

A system is described that monitors and collects electromagnetic

(EM) field strength Information at five (optionally 10) locations

simultaneously. The system has two modes of operation: (1) for

sampling EM fields that are stationary for times of the order of

200 ms, and (2) for sampling changing EM fields with a system

resolution of 10 ys. Sensing elements for Mode 1 consist of three

electrically short orthogonal dipoles mounted together, single

dipole elements, or small loop antennas. Each element feeds a separate data input channel for a total of 15 (optionally 30)

channels. Rf energy is converted to dc by a diode detector at

each dipole. Mode 2 sensors will be diode detectors driven by

broadband antennas. Real time system data processing includes

calculation of field strength based on probe calibrations and

processing of resultant data to satisfy measurement goals.

12. KEY WORDS (S/x to twelve entries; alphabetical order; capitalize only proper names; and separate key words by semicolons)

automated measurement; electromagnetic field probe;

^ high impedance; high speed; simultaneous sampling.

13. AVAILABILITY

|_'^Unlimited

( I For Official Distribution. Do Not Release to NTIS

Order From Superintendent of Documents, U.S. Government Printing Office, Washington, D.C. 20402.

Order From National Technical Information Service (NTIS), Springfield, VA. 22161

14. NO. OF

PRINTED PAGES

70

15. Price

USCOMM-DC 6043-PB0

U.S. 0OVERNMENT PRINTINS OFFICE: 1906 77S-66S/6S027