# Patent

## Title
Patterning a plurality of fields on a substrate to compensate for differing evaporation times

## Abstract

A method of patterning a substrate comprising a plurality of fields, including, inter alia, positioning a first volume of fluid on a first subset of the plurality of fields of the substrate, with the first volume of fluid being subjected to a first evaporation time; positioning a second volume of fluid on a second subset of the plurality of fields of the substrate, differing from the first subset, with the second volume of fluid being subjected to a second evaporation time, differing from the first evaporation time; and patterning the first and second subsets of the plurality of fields, with the first subset of the plurality of fields being patterned prior to the second subset of the plurality of fields being patterned, with a volume associated with the second subset of the plurality of fields being greater than a volume associated with the first subset of the plurality of fields to compensate for the second evaporation time being greater than the first evaporation time.

## Background
CROSS-REFERENCE TO RELATED APPLICATION
The present application claims priority to U.S. Provisional Application No. 60/788,782, filed on Apr. 3, 2006, entitled “Pre-dispense of Liquid for High-Throughput Step and Repeat Imprint Lithography,” which is incorporated herein by reference.


BACKGROUND INFORMATION
Nano-fabrication involves the fabrication of very small structures, e.g., having features on the order of nanometers or smaller. One area in which nano-fabrication has had a sizeable impact is in the processing of integrated circuits. As the semiconductor processing industry continues to strive for larger production yields while increasing the circuits per unit area formed on a substrate, nano-fabrication becomes increasingly important. Nano-fabrication provides greater process control while allowing increased reduction of the minimum feature dimension of the structures formed. Other areas of development in which nano-fabrication has been employed include biotechnology, optical technology, mechanical systems and the like.
An exemplary nano-fabrication technique is commonly referred to as imprint lithography. Exemplary imprint lithography processes are described in detail in numerous publications, such as United States patent application publication 2004/0065976 filed as U.S. patent application Ser. No. 10/264,960, entitled “Method and a Mold to Arrange Features on a Substrate to Replicate Features having Minimal Dimensional Variability” ; United States patent application publication 2004/0065252 filed as U.S. patent application Ser. No. 10/264,926, entitled “Method of Forming a Layer on a Substrate to Facilitate Fabrication of Metrology Standards”; and U.S. Pat. No. 6,936,194, entitled “Functional Patterning Material for Imprint Lithography Processes,” all of which are assigned to the assignee of the present invention.
The imprint lithography technique disclosed in each of the aforementioned United States patent application publications and United States patent includes formation of a relief pattern in a polymerizable layer and transferring a pattern corresponding to the relief pattern into an underlying substrate. The substrate may be positioned upon a stage to obtain a desired position to facilitate patterning thereof To that end, a mold is employed spaced-apart from the substrate with a formable liquid present between the mold and the substrate. The liquid is solidified to form a patterned layer that has a pattern recorded therein that is conforming to a shape of the surface of the mold in contact with the liquid. The mold is then separated from the patterned layer such that the mold and the substrate are spaced-apart. The substrate and the patterned layer are then subjected to processes to transfer, into the substrate, a relief image that corresponds to the pattern in the patterned layer.



BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a simplified side view of a lithographic system having a template spaced-apart from a substrate;
FIG. 2 is a simplified side view of the substrate shown in FIG. 1, having a patterned layer positioned thereon;
FIG. 3 is a top down view of the substrate shown in FIG. 1 showing a plurality of fields in a first embodiment;
FIG. 4 is a top down view of the substrate shown in FIG. 1 showing a plurality of fields in a second embodiment; and
FIG. 5 is a flow diagram showing a method of patterning the plurality of fields of the substrate shown in FIG. 4.



DETAILED DESCRIPTION
Referring to FIG. 1, a system 10 to form a relief pattern on a substrate 12 is shown. Substrate 12 may be coupled to a substrate chuck 14. Substrate chuck 14 may be any chuck including, but not limited to, vacuum, pin-type, groove-type, or electromagnetic, as described in U.S. Pat. No. 6,873,087 entitled “High-Precision Orientation Alignment and Gap Control Stages for Imprint Lithography Processes,” which is incorporated herein by reference. Substrate 12 and substrate chuck 14 may be supported upon a stage 16. Further, stage 16, substrate 12, and substrate chuck 14 may be positioned on a base (not shown). Stage 16 may provide motion about the x and y axes.
Spaced-apart from substrate 12 is a template 18 having a mold 20 extending therefrom towards substrate 20 with a patterning surface 22 thereon. Further, mesa 20 may be referred to as a mold 20. Mesa 20 may also be referred to as a nanoimprint mold 20. In a further embodiment, template 18 may be substantially absent of mold 20. Template 18 and/or mold 20 may be formed from such materials including but not limited to, fused-silica, quartz, silicon, organic polymers, siloxane polymers, borosilicate glass, fluorocarbon polymers, metal, and hardened sapphire. As shown, patterning surface 22 comprises features defined by a plurality of spaced-apart recesses 24 and protrusions 26. However, in a further embodiment, patterning surface 22 may be substantially smooth and/or planar. Patterning surface 20 may define an original pattern that forms the basis of a pattern to be formed on substrate 12.
Template 18 may be coupled to a template chuck 28, template chuck 28 being any chuck including, but not limited to, vacuum, pin-type, groove-type, or electromagnetic, as described in U.S. Pat. No. 6,873,087 entitled “High-Precision Orientation Alignment and Gap Control Stages for Imprint Lithography Processes”. Template chuck 28 may be coupled to an imprint head 30 to facilitate movement of template 18 and mold 20.
System 10 further comprises a fluid dispense system 32. Fluid dispense system 32 may be in fluid communication with substrate 12 so as to deposit a polymeric material 34 thereon. System 10 may comprise any number of fluid dispensers and fluid dispense system 32 may comprise a plurality of dispensing units therein. Polymeric material 34 may be positioned upon substrate 12 using any known technique, e.g., drop dispense, spin-coating, dip coating, chemical vapor deposition (CVD), physical vapor deposition (PVD), thin film deposition, thick film deposition, and the like. As shown, polymeric material 34 may be deposited upon substrate 12 as a plurality of spaced-apart droplets 36. Typically, polymeric material 34 is disposed upon substrate 12 before the desired volume is defined between mold 20 and substrate 12. However, polymeric material 34 may fill the volume after the desired volume has been obtained.
Referring to FIGS. 1 and 2, system 10 further comprises a source 38 of energy 40 coupled to direct energy 40 along a path 42. Imprint head 30 and stage 16 are configured to arrange mold 20 and substrate 12, respectively, to be in superimposition and disposed in path 42. Either imprint head 30, stage 16, or both vary a distance between mold 20 and substrate 12 to define a desired volume therebetween such that mold 20 contacts polymeric material 34 and the desired volume is filled by polymeric material 34. More specifically, polymeric material 34 of droplets 36 may ingress and fill recesses 24 of mold 20. After the desired volume is filled with polymeric material 34, source 38 produces energy 40, e.g., broadband ultraviolet radiation that causes polymeric material 34 to solidify and/or cross-link conforming to the shape of a surface 44 of substrate 12 and patterning surface 22, defining a patterned layer 46 on substrate 12. Patterned layer 46 may comprise a residual layer 48 and a plurality of features shown as protrusions 50 and recessions 52. System 10 may be regulated by a processor 54 that is in data communication with stage 16, imprint head 30, fluid dispense system 32, and source 38, operating on a computer readable program stored in memory 56.
Referring to FIGS. 1 and 3, substrate 12 may comprise a plurality of fields, shown as fields a-d. However, in a further embodiment, substrate 12 may comprise any number of fields. Each of fields a-d of substrate 12 may be subjected to the aforementioned patterning process. In a first embodiment, all of fields a-d of substrate 12 may have polymeric material 34 positioned thereon concurrently by fluid dispense system 32. In a further embodiment, polymeric material 34 may be positioned on fields a-d of substrate 12 sequentially by fluid dispense system 32. Fields a-d of substrate 12 may have a volume Vdispense positioned thereon by fluid dispense system 32.
Polymeric material 34 positioned on each of fields a-d of substrate 12 may fill the desired volume between mold 20 and substrate 12, and more specifically, ingress and fill recesses 24 of mold 20, as described above. Mold 20 may contact polymeric material 34 positioned on each of fields a-d of substrate 12 sequentially. More specifically, mold 20 may contact polymeric material 34 positioned on field a of substrate 12 prior to contacting fields b-d of substrate 12; mold 20 may contact polymeric material 34 positioned on field b of substrate 12 after contacting field a of substrate 12 and prior to contacting fields c-d of substrate 12 contact mold 20; mold 20 may contact polymeric material 34 positioned on field c of substrate 12 after contacting field b of substrate 12 and prior to contacting field d of substrate 12; and mold 20 may contact polymeric material 34 positioned on field d of substrate 12 after contacting field c of substrate 12. In a further embodiment, any desired sequential order of contacting polymeric material 34 on fields a-d of substrate may be employed.
As a result of mold 20 contacting polymeric material 34 positioned on fields a-d of substrate 12 sequentially, each of fields a-d of substrate 12 may be subjected to differing evaporation times. More specifically, a time between positioning polymeric material 34 on a field a-d of substrate 12 and mold 20 contacting polymeric material 34 on the field a-d of substrate 12 may be referred to as an “evaporation time” of polymeric material 34 positioned on the field a-d of substrate 12. To that end, a volume of polymeric material 34 positioned on a field a-d of substrate 12 upon contact with mold 20 may differ from a volume of polymeric material 34 positioned on the field a-d of substrate 12 by fluid dispense system 32. This may result from, inter alia, the evaporation time associated with fields a-d of substrate 12. To that end, polymeric material 34 positioned on field a of substrate 12 may have a first evaporation time Ta associated therewith resulting in the volume of polymeric material 34 positioned on field a upon contact with mold 20 being VevapA, with VevapA being less than Vdispense; polymeric material 34 positioned on field b of substrate 12 may have a second evaporation time Tb associated therewith resulting in the volume of polymeric material 34 positioned on field b upon contact with mold 20 being VevapB, with VevapB being less than Vdispense; polymeric material 34 positioned on field c of substrate 12 may have a third evaporation time Tc associated therewith resulting in the volume of polymeric material 34 positioned on field c upon contact with mold 20 being VevapC, with VevapC being less than Vdispense; and polymeric material 34 positioned on field d of substrate 12 may have a fourth evaporation time Td associated therewith resulting in the volume of polymeric material 34 positioned on field d upon contact with mold 20 being VevapD, with VevapD being less than Vdispense.
As mentioned above, mold 20 contacts fields a-d of substrate 12 sequentially. Thus, polymeric material 34 on a first subset of fields a-d of substrate 12 that are contacted by mold 20 subsequent to polymeric material 34 on a second subset of fields a-d of substrate 12, differing from the first subset, being contacted by mold 20 will have a greater evaporation time associated therewith. More specifically, evaporation time Tb may be greater than evaporation time Ta; evaporation time Tc may be greater than evaporation time Tb; and evaporation time Td may be greater than evaporation time Tc. In summary, evaporation times Ta, Tb, Tc, and Td may be defined as follows:

Td>Tc>Tb>Ta.   (1)

As a result of the evaporation time being greater for polymeric material 34 on the aforementioned first subset of fields a-d of substrate 12 compared to the evaporation time for polymeric material 34 on the aforementioned second subset of fields a-d of substrate 12, the volume of polymeric material 34 on the aforementioned second subset of fields a-d of substrate 12 upon contact with mold 20 will be greater than the volume of polymeric material 34 on the aforementioned first subset of fields a-d of substrate 12 upon contact with mold 20. More specifically, volume VevapA of polymeric material 34 on field a of substrate 12 upon contact with mold 20 is greater than VevapB of polymeric material 34 on field b of substrate 12 upon contact with mold 20; volume VevapB of polymeric material 34 on field b of substrate 12 upon contact with mold 20 is greater than VevapC of polymeric material 34 on field c of substrate 12 upon contact with mold 20; and volume VevapC of polymeric material 34 on field c of substrate 12 upon contact with mold 20 is greater than VevapD of polymeric material 34 on field d of substrate 12 upon contact with mold 20. In summary, volumes VevapA, VevapB, VevapC, and VevapD, of polymeric material 34 on fields a, b, c, and d, respectively, of substrate 12, upon contact with mold 20, may be defined as follows:

VevapA>VevapB>VevapC>VevapD.   (2)

Referring to FIGS. 1-3, to that end, contacting polymeric material 34 positioned on fields a-d of substrate 12 with mold 20 each having a differing volume associated therewith, may result in pattern distortion of features formed from polymeric material 34 in patterned layer 46; low fidelity of features form from polymeric material 34 in patterned layer 46, and a non-uniform thickness of residual layer 48 across patterned layer 46, all of which are undesirable.
Referring to FIGS. 1 and 3, to compensate for the evaporation of polymeric material 34 positioned on fields a-d of substrate 12, the volume Vdispense positioned on each of fields a-d of substrate 12 by fluid dispense system 32 may be varied. More specifically, the volume Of Vdispense positioned on the aforementioned first subset of fields a-d of substrate 12 by fluid dispense system 32 may be increased as compared to the volume Vdispense positioned on the aforementioned second subset of fields a-d of substrate 12 by fluid dispense system 32. As a result, upon contact with mold 20, each of fields a-d of substrate 12 may have substantially the same volume of polymeric material 34, which may be desired.
More specifically, the volume VdispenseD positioned on field d of substrate 12 by fluid dispense system 32 is greater than the volume VdispenseC positioned on field c of substrate 12 by fluid dispense system 32; the volume VdispenseC positioned on field c of substrate 12 by fluid dispense system 32 is greater than the volume VdispenseB positioned on field b of substrate 12 by fluid dispense system 32; and the volume VdispenseB positioned on field b of substrate 12 by fluid dispense system 32 is greater than the volume VdispenseA positioned on field a of substrate 12 by fluid dispense system 32. In summary, volumes VdispenseA, VdispenseB, VdispenseC, and VdispenseD, of polymeric material 34 on fields a, b, c, and d, respectively, positioned on substrate 12 by fluid dispense system 32 may be defined as follows:

VdispenseD>VdispenseC>VdispenseB>VdispenseA   (3)

As a result of positioning polymeric material 32 on field a having a volume VdispenseA and subjecting polymeric material 32 on field a of substrate 12 to evaporation time Ta, the volume of polymeric material 32 on field a of substrate 12 upon contact with mold 20 is VfinalA; as a result of positioning polymeric material 32 on field b having a volume VdispenseB and subjecting polymeric material 32 on field b of substrate 12 to evaporation time Tb, the volume of polymeric material 32 on field b of substrate 12 upon contact with mold 20 is VfinalB; as a result of positioning polymeric material 32 on field c having a volume VdispenseC and subjecting polymeric material 32 on field c of substrate 12 to evaporation time Tc, the volume of polymeric material 32 on field c of substrate 12 upon contact with mold 20 is VfinalC; and as a result of positioning polymeric material 32 on field d having a volume VdispenseD and subjecting polymeric material 32 on field d of substrate 12 to evaporation time Td, the volume of polymeric material 32 on field d of substrate 12 upon contact with mold 20 is VfinalD. To that end, the volumes VfinalA, VfinalB, VfinalC, and VfinalD of polymeric material 32 positioned on fields a, b, c, and d, respectively of substrate upon contact with mold 20 may be all substantially the same.
Referring to FIGS. 1-3, to determine the volumes VdispenseA, VdispenseB, VdispenseC, and VdispenseD of polymeric material 34 positioned on fields a-d of substrate 12, respectively, direct imaging of polymeric material 34 in droplets 40 positioned on each field a-d of substrate 12 may be employed. In a further embodiment, film thickness metrology of patterned layer 46 may be employed.
Referring to FIG. 1, in a further embodiment, after mold 20 contacts polymeric material 34 on a field a-d of substrate 12, source 38 may produce energy 40 to cause polymeric material 34 to be solidified and/or cross-linked, as mentioned above. However, polymeric material 34 positioned on surrounding fields a-d of substrate 12 may be concurrently exposed to energy 40, and thus, may be solidified and/or cross-linked prior to contact with mold 20, which is undesirable. Solidifying and/or cross-linking of polymeric material 34 positioned on the surrounding fields a-d of substrate 12 may result in, inter alia, problematic control of the thickness of subsequently disposed layers on the surrounding fields a-d of substrate 12 and formation of deleterious artifacts in layers formed on the surrounding fields a-d of substrate 12, all of which are undesirable. To that end, a method of patterning substrate 12 to minimize, if not prevent, undesired curing and/or cross-linking of polymeric material 32 on surrounding fields a-d of substrate 12 is described further below.
Referring to FIGS. 1 and 4, substrate 12 is shown have a plurality of fields w-z. Each field w-z of substrate 12 comprises a plurality of sub-fields, i.e., field w of substrate 12 comprises sub-fields w1-w4; field x of substrate 12 comprises sub-fields x1-x4; field y of substrate 12 comprises sub-fields y1-y4; and field z of substrate 12 comprises sub-fields z1-z4. Each sub-field of a field w-z of substrate 12 may be spaced-apart from the remaining sub-fields of the field w-z of substrate 12 by the remaining fields w-z of substrate 12. More specifically, each sub-field w1-w4 of field w of substrate 12 may be separated from the remaining sub-fields w1-w4 of field w of substrate 12 by fields x-z; each sub-field x1-x4 of field x of substrate 12 may be separated from the remaining sub-fields x1-x4 of field x of substrate 12 by fields w, y, and z; each sub-field y1-y4 of field y of substrate 12 may be separated from the remaining sub-fields y1-y4 of field y of substrate 12 by fields w, x, and z; and each sub-field z1-z4 of field z of substrate 12 may be separated from the remaining sub-fields z1-z4 of field z of substrate 12 by fields w-y.
Referring to FIGS. 1, 4, and 5, a process flow for patterning substrate 12 having fields w-z is shown. At step 100, polymeric material 34 may be positioned on field w using any of the techniques mentioned above. Polymeric material 28 may be positioned on field w concurrently by fluid dispense system 32, or in a further embodiment, polymeric material 34 may be positioned on sub-fields w1-w4 of field w of substrate 12 sequentially by fluid dispense system 32.
At step 102, subsequent to positioning polymeric material 34 on field w, mold 20 may contact polymeric material 34 positioned on each sub-field w1-w4 of field w of substrate 12. Mold 20 may contact polymeric material 34 positioned on sub-field w1 of substrate 12 prior to contacting sub-fields w2-w4 of substrate 12, with polymeric material 34 on sub-field w1 of substrate 12 being subsequently solidified or cross-linked; mold 20 may contact polymeric material 34 positioned on sub-field w2 of substrate 12 after contacting sub-field w1 of substrate 12 and prior to contacting sub-fields w3-w4 of substrate 12 with polymeric material 34 on sub-field w2 of substrate 12 being subsequently solidified or cross-linked; mold 20 may contact polymeric material 34 positioned on sub-field w3 of substrate 12 after contacting sub-field w2 of substrate 12 and prior to contacting sub-field w4 of substrate 12 with polymeric material 34 on sub-field w3 of substrate 12 being subsequently solidified or cross-linked; mold 20 may contact polymeric material 28 positioned on sub-field w4 of substrate 12 after contacting sub-field w3 of substrate 12 with polymeric material 34 on sub-field w4 of substrate 12 being subsequently solidified or cross-linked.
At step 104, polymeric material 34 may be positioned on field x using any of the techniques mentioned above. Polymeric material 28 may be positioned on field x concurrently by fluid dispense system 32, or in a further embodiment, polymeric material 34 may be positioned on sub-fields x1-x4 of field x of substrate 12 sequentially by fluid dispense system 32.
At step 106, subsequent to positioning polymeric material 34 on field x, mold 20 may contact polymeric material 34 positioned on each sub-field x1-x4 of field x of substrate 12. Mold 20 may contact polymeric material 34 positioned on sub-field x1 of substrate 12 prior to contacting sub-fields x2-x4 of substrate 12, with polymeric material 34 on sub-field x1 of substrate 12 being subsequently solidified or cross-linked; mold 20 may contact polymeric material 34 positioned on sub-field x2 of substrate 12 after contacting sub-field x1 of substrate 12 and prior to contacting sub-fields x3-x4 of substrate 12 with polymeric material 34 on sub-field x2 of substrate 12 being subsequently solidified or cross-linked; mold 20 may contact polymeric material 34 positioned on sub-field x3 of substrate 12 after contacting sub-field x2 of substrate 12 and prior to contacting sub-field x4 of substrate 12 with polymeric material 34 on sub-field x3 of substrate 12 being subsequently solidified or cross-linked; mold 20 may contact polymeric material 28 positioned on sub-field x4 of substrate 12 after contacting sub-field x3 of substrate 12 with polymeric material 34 on sub-field x4 of substrate 12 being subsequently solidified or cross-linked.
At step 108, polymeric material 34 may be positioned on field y using any of the techniques mentioned above. Polymeric material 28 may be positioned on field y concurrently by fluid dispense system 32, or in a further embodiment, polymeric material 34 may be positioned on sub-fields y1-y4 of field y of substrate 12 sequentially by fluid dispense system 32.
At step 110, subsequent to positioning polymeric material 34 on field y, mold 20 may contact polymeric material 34 positioned on each sub-field y1-y4 of field y of substrate 12. Mold 20 may contact polymeric material 34 positioned on sub-field y1 of substrate 12 prior to contacting sub-fields y2-y4 of substrate 12, with polymeric material 34 on sub-field y1 of substrate 12 being subsequently solidified or cross-linked; mold 20 may contact polymeric material 34 positioned on sub-field y2 of substrate 12 after contacting sub-field y1 of substrate 12 and prior to contacting sub-fields y3-y4 of substrate 12 with polymeric material 34 on sub-field y2 of substrate 12 being subsequently solidified or cross-linked; mold 20 may contact polymeric material 34 positioned on sub-field y3 of substrate 12 after contacting sub-field y2 of substrate 12 and prior to contacting sub-field y4 of substrate 12 with polymeric material 34 on sub-field y3 of substrate 12 being subsequently solidified or cross-linked; mold 20 may contact polymeric material 28 positioned on sub-field y4 of substrate 12 after contacting sub-field y3 of substrate 12 with polymeric material 34 on sub-field y4 of substrate 12 being subsequently solidified or cross-linked.
At step 112, polymeric material 34 may be positioned on field z using any of the techniques mentioned above. Polymeric material 28 may be positioned on field z concurrently by fluid dispense system 32, or in a further embodiment, polymeric material 34 may be positioned on sub-fields z1-z4 of field w of substrate 12 sequentially by fluid dispense system 32.
At step 114, subsequent to positioning polymeric material 34 on field z, mold 20 may contact polymeric material 34 positioned on each sub-field z1-z4 of field z of substrate 12. Mold 20 may contact polymeric material 34 positioned on sub-field z1 of substrate 12 prior to contacting sub-fields z2-z4 of substrate 12, with polymeric material 34 on sub-field z1 of substrate 12 being subsequently solidified or cross-linked; mold 20 may contact polymeric material 34 positioned on sub-field z2 of substrate 12 after contacting sub-field z1 of substrate 12 and prior to contacting sub-fields z3-z4 of substrate 12 with polymeric material 34 on sub-field z2 of substrate 12 being subsequently solidified or cross-linked; mold 20 may contact polymeric material 34 positioned on sub-field z3 of substrate 12 after contacting sub-field z2 of substrate 12 and prior to contacting sub-field z4 of substrate 12 with polymeric material 34 on sub-field z3 of substrate 12 being subsequently solidified or cross-linked; mold 20 may contact polymeric material 28 positioned on sub-field z4 of substrate 12 after contacting sub-field z3 of substrate 12 with polymeric material 34 on sub-field z4 of substrate 12 being subsequently solidified or cross-linked.
The embodiments of the present invention described above are exemplary. Many changes and modifications may be made to the disclosure recited above, while remaining within the scope of the invention. Therefore, the scope of the invention should not be limited by the above description, but instead should be determined with reference to the appended claims along with their full scope of equivalents.

## Claims

1. A method of patterning a substrate comprising a plurality of fields, said method comprising:
positioning a first volume of fluid on a first subset of said plurality of fields of said substrate, with said first volume of fluid being subjected to a first evaporation time, said first evaporation time being a time between positioning said first volume of fluid on said first subset and patterning said first subset;
positioning a second volume of fluid on a second subset of said plurality of fields of said substrate, differing from said first subset, with said second volume of fluid differing from said first volume of fluid and being subjected to a second evaporation time, differing from said first evaporation time, said second evaporation time being a time between positioning said second volume of fluid on said second subset and patterning said second subset; and
patterning using an imprint lithography template said first volume of fluid on said first subset of said plurality of fields defining a first patterned layer on said substrate, the first patterned layer having a volume; and,
patterning using the imprint lithography template said second volume of fluid on said second subsets of said plurality of fields defining a second patterned layer on said substrate, the second patterned layer having a volume, wherein said first volume of fluid and said second volume of fluid are determined relative to the first and second evaporation times such that said volume associated with said first patterned layer is substantially same as said volume associated with said second patterned layer.

2. The method as recited in claim 1 further including positioning said first and second volumes of fluid on said first and second subsets of said plurality of fields, respectively, concurrently.

3. The method as recited in claim 1 further including positioning said first volume of fluid on said first subset of said plurality of fields prior to positioning said second volume of fluid on said second subset of said plurality of fields.

4. The method as recited in claim 1 wherein the step of patterning further includes contacting said fluid with a mold having a pattern therein.

5. The method as recited in claim 1 wherein a third subset of said plurality of fields, differing from said first and second subsets of said plurality of fields, surrounds said first subset of said plurality of fields, with said third subset being substantially absent of fluid.

6. The method as recited in claim 1 wherein a third subset of said plurality of fields, differing from said first and second subsets of said plurality of fields, surrounds said second subset of said plurality of fields, with said third subset being substantially absent of fluid.

7. The method as recited in claim 1 wherein the step of positioning further includes disposing said fluid as a plurality of droplets.

8. A method of patterning a substrate comprising a plurality of fields, said method comprising:
positioning a first volume of fluid on a first subset of said plurality of fields of said substrate;
positioning a second volume of fluid on a second subset of said plurality of fields of said substrate, differing from said first subset with said second volume of fluid being different from said first volume of fluid; and
patterning using an imprint lithography template said first volume of fluid on said first subset of said plurality of fields forming a first patterned layer having a first volume; and;
patterning using an imprint lithography template said second volume of fluid on said second subset of said plurality of fields forming a second patterned layer having a second volume, wherein said first volume of fluid and said second volume of fluid are determined relative to a first evaporation time of said first volume of fluid and a second evaporation time of said second volume of fluid such that the first volume associated with said first patterned layer is substantially same as the second volume associated with said second patterned layer.

9. The method as recited in claim 8 further including positioning said first and second volumes of fluid on said first and second subsets of said plurality of fields, respectively, concurrently.

10. The method as recited in claim 8 further including positioning said first volume of fluid on said first subset of said plurality of fields prior to positioning said second volume of fluid on said second subset of said plurality of fields.

11. The method as recited in claim 8 wherein the step of patterning further includes contacting said fluid with a mold having a pattern therein.

12. The method as recited in claim 8 wherein a third subset of said plurality of fields, differing from said first and second subsets of said plurality of fields, surrounds said first subset of said plurality of fields, with said third subset being substantially absent of fluid.

13. The method as recited in claim 8 wherein a third subset of said plurality of fields, differing from said first and second subsets of said plurality of fields, surrounds said second subset of said plurality of fields, with said third subset being substantially absent of fluid.

14. The method as recited in claim 8 wherein the step of positioning further includes disposing said fluid as a plurality of droplets.

15. A method of patterning a substrate comprising a plurality of fields in a nanoimprint lithography system, said method comprising:
positioning a first volume of a nanoimprint fluid on a first subset of said plurality of fields of said substrate, with said first volume being subjected to a first evaporation time, said first evaporation time being a time between positioning said first volume on said first subset and patterning said first subset;
positioning a second volume of a nanoimprint fluid on a second subset of said plurality of fields of said substrate, differing from said first subset, with said second volume being greater than said first volume, with said second volume being subjected to a second evaporation time; and
patterning using an imprint lithography template said first volume of nanoimprint fluid on said first subset of said plurality of fields forming a first patterned layer having a first volume; and,
patterning using the imprint lithography template said second volume of nanoimprint fluid on said second subset of said plurality of fields forming a second patterned layer having a second volume, wherein said first volume of fluid and said second volume of fluid are determined relative to the first and second evaporation times such that the first volume associated with said first patterned layer is substantially same as the second volume associated with said second patterned layer.

16. The method as recited in claim 15 further including positioning said first and second volumes of said nanoimprint fluid on said first and second subsets of said plurality of fields, respectively, concurrently.

17. The method as recited in claim 15 further including positioning said first volume of said nanoimprint fluid on said first subset of said plurality of fields prior to positioning said second volume of said nanoimprint fluid on said second subset of said plurality of fields.

18. The method as recited in claim 15 wherein the step of patterning further includes contacting said fluid with a nanoimprint mold assembly having a pattern therein.

19. The method as recited in claim 15 wherein a third subset of said plurality of fields, differing from said first and second subsets of said plurality of fields, surrounds said first subset of said plurality of fields, with said third subset being substantially absent of said nanoimprint fluid.

20. The method as recited in claim 15 wherein a third subset of said plurality of fields, differing from said first and second subsets of said plurality of fields, surrounds said second subset of said plurality of fields, with said third subset being substantially absent of said nanoimprint fluid.

21. The method as recited in claim 15 wherein the step of positioning further includes disposing said nanoimprint fluid as a plurality of droplets.