Federal Register / Vol. 76, No. 40 / Tuesday, March 1, 2011 / Notices 11199 

Department Contact 

Suspended Investigations 

No Sunset Review of suspended investigations are scheduled for initiation in April 2011. 

The Department’s procedures for the 

conduct of Sunset Reviews are set forth 

in 19 CFR 351.218. Guidance on 

methodological or analytical issues 

relevant to the Department’s conduct of 

Sunset Reviews is set forth in the 

Department’s Policy Bulletin 98.3— 

Policies Regarding the Conduct of Fiveyear (‘‘Sunset’’) Reviews of Antidumping 

and Countervailing Duty Orders; Policy 

Bulletin, 63 FR 18871 (April 16, 1998). 

The Notice of Initiation of Five-Year 

(‘‘Sunset’’) Reviews provides further 

information regarding what is required 

of all parties to participate in Sunset 

Reviews. 

Pursuant to 19 CFR 351.103(c), the 

Department will maintain and make 

available a service list for these 

proceedings. To facilitate the timely 

preparation of the service list(s), it is 

requested that those seeking recognition 

as interested parties to a proceeding 

contact the Department in writing 

within 10 days of the publication of the 

Notice of Initiation. 

Please note that if the Department 

receives a Notice of Intent to Participate 

from a member of the domestic industry 

within 15 days of the date of initiation, 

the review will continue. Thereafter, 

any interested party wishing to 

participate in the Sunset Review must 

provide substantive comments in 

response to the notice of initiation no 

later than 30 days after the date of 

initiation. 

This notice is not required by statute 

but is published as a service to the 

international trading community. 

Dated: February 16, 2011. 

Christian Marsh, 

Deputy Assistant Secretary for Antidumping 

and Countervailing Duty Operations. 

[FR Doc. 2011–4523 Filed 2–28–11; 8:45 am] 

BILLING CODE 3510–DS–P 

DEPARTMENT OF COMMERCE 

International Trade Administration 

Application(s) for Duty-Free Entry of 

Scientific Instruments 

Pursuant to Section 6(c) of the 

Educational, Scientific and Cultural 

Materials Importation Act of 1966 (Pub. 

L. 89–651, as amended by Public Law 

106–36; 80 Stat. 897; 15 CFR part 301), 

we invite comments on the question of 

whether instruments of equivalent 

scientific value, for the purposes for 

which the instruments shown below are 

intended to be used, are being 

manufactured in the United States. 

Comments must comply with 15 CFR 

301.5(a)(3) and (4) of the regulations and 

be postmarked on or before March 21, 

2011. Address written comments to 

Statutory Import Programs Staff, Room 

3720, U.S. Department of Commerce, 

Washington, DC 20230. Applications 

may be examined between 8:30 a.m. and 

5 p.m. at the U.S. Department of 

Commerce in Room 3720. 

Docket Number: 10–045. Applicant: 

Battelle Memorial Institute, Pacific 

Northwest Division, Pacific Northwest 

National Laboratory, 3335 Q Ave., 

Richland, WA 99354. Instrument: 

Electron Microscope. Manufacturer: FEI 

Company, the Netherlands. Intended 

Use: This instrument will be used as an 

analytical tool for doing serial 

sectioning and producing 3D analytical 

analysis for both geological and material 

science samples. Justification for DutyFree Entry: There are no instruments of 

the same general category manufactured 

in the United States. Application 

accepted by Commissioner of Customs: 

February 2, 2011. 

Docket Number: 10–072. Applicant: 

University of Puerto Rico, Institute of 

Neurobiology, PO Box 365067, San 

Juan, Puerto Rico 00936–5067. 

Instrument: Electron Microscope. 

Manufacturer: JEOL Ltd., Japan. 

Intended Use: The instrument will be 

used to reconstruct the remodeling 

synapses in the regenerating tectum, 

quantify the numbers and types of 

synapses, and quantify the effect that 

changes in brain-derived neurotrophic 

factors have on these synapses made by 

regenerated axons in the brain. The 

instrument will also enable the 

unequivocal identification of synapses 

made by Engrailed-expressing neurons, 

something that is impossible to do any 

other way. Additionally, the instrument 

will be used to study the location of 

aminergic receptors and transporter 

molecules in specific areas of the central 

nervous systems of freshwater prawns. 

Justification for Duty-Free Entry: There 

are no instruments of the same general 

category manufactured in the United 

States. Application accepted by 

Commissioner of Customs: December 

22, 2010. 

Docket Number: 10–076. Applicant: 

Regents of the University of Minnesota, 

12 Shepherd Labs 100 Union St, SE., 

Minneapolis, MN 55455. Instrument: 

Electron Microscope. Manufacturer: FEI 

Inc., Czech Republic. Intended Use: The 

instrument will support structural study 

of the mechanisms of virus assembly 

and infection, kidney structure and 

function in disease, bacterial infection 

and host response, and other 

applications. Justification for Duty-Free 

Entry: There are no instruments of the 

same general category manufactured in 

the United States. Application accepted 

by Commissioner of Customs: December 

29, 2010. 

Docket Number: 11–002. Applicant: 

Weill Cornell Medical College of Cornell 

University, 1300 York Avenue, New 

York, NY 10065. Instrument: Electron 

Microscope. Manufacturer: JEOL Ltd., 

Japan. Intended Use: The instrument 

will allow users to acquire well focused, 

high contrast, high quality images 

through the full range of magnifications, 

from 50x to 1,200,000x. Justification for 

Duty-Free Entry: There are no 

instruments of the same general 

category manufactured in the United 

States. Application accepted by 

Commissioner of Customs: January 11, 

2011. 

Docket Number: 11–003. Applicant: 

Armed Forces Institute of Pathology, 

Department of Veterinary Pathology, 

Bldg. 54, Room G111, 6825 16th St., 

NW., Washington, DC 20306–6000. 

Instrument: Electron Microscope. 

Manufacturer: JEOL Ltd., Japan. 

Intended Use: The instrument will be 

used to examine tissue specimens to 

identify and characterize pathologic 

tissue changes, determine disease 

diagnosis and severity, and aid in 

prognosis and treatment of patients as 

applicable. The required capabilities 

that this instrument provides are a 

voltage range between 40kV and 120 kV, 

a resolution of 0.2nm line and 0.38nm 

point, and a magnification of x50 to 

600,000, among other requirements. 

Justification for Duty-Free Entry: There 

are no instruments of the same general 

category manufactured in the United 

States. Application accepted by 

Commissioner of Customs: January 11, 

2011. 

Docket Number: 11–004. Applicant: 

San Diego State University, 5500 

Campanile Drive, San Diego, CA 92182. 

Instrument: Electron Microscope. 

Manufacturer: FEI Inc., Czech Republic. 

Intended Use: The instrument will be 

used for many applications including 


jlentini on DSKJ8SOYB1PROD with NOTICES
11200 Federal Register / Vol. 76, No. 40 / Tuesday, March 1, 2011 / Notices 

the study of unicellular photosynthetic 

cells, arachnid systematics, and 

geochronology and provenance studies. 

The instrument will allow high quality, 

high throughput flow with a scope of 

advanced capability. It will also allow 

uncoated museum samples to be viewed 

without damage. Justification for DutyFree Entry: There are no instruments of 

the same general category manufactured 

in the United States. Application 

accepted by Commissioner of Customs: 

January 13, 2011. 

Docket Number: 11–005. Applicant: 

National Institute of Standards and 

Technology, DOC, 325 Broadway, 

Boulder, Colorado 80305–3328. 

Instrument: Electron Microscope. 

Manufacturer: JEOL Ltd., Japan. 

Intended Use: The instrument will be 

used to study semiconductor, metallic 

magnetic and nanostructured materials’ 

structure and composition, with 

nanoscale and atomic level resolution. 

The required capabilities that the 

instrument provides include high 

resolution energy filtered and scanning 

transmission electron miscroscopy, 

convergent beam and selected area 

electron diffraction, and electron energy 

loss and energy dispersive X-ray 

spectroscopy. Justification for Duty-Free 

Entry: There are no instruments of the 

same general category manufactured in 

the United States. Application accepted 

by Commissioner of Customs: January 

14, 2011. 

Docket Number: 11–006. Applicant: 

University of Vermont, 19 Roosevelt 

Hwy., Suite 120 Colchester, Vermont 

65446. Instrument: Electron Microscope. 

Manufacturer: JEOL Ltd., Japan. 

Intended Use: The instrument will be 

used to investigate advanced glycation 

end product localization using postembedding immunoelectron microscopy 

techniques on thin sections from human 

cardiac biopsies. Required 

characteristics of the instrument include 

120 kV accelerating voltage, and an 

electron gun assembly with Cool Beam 

Illumination System—LaB6 filament 

standard. Justification for Duty-Free 

Entry: There are no instruments of the 

same general category manufactured in 

the United States. Application accepted 

by Commissioner of Customs: January 

19, 2011. 

Docket Number: 11–007. Applicant: 

University of Arkansas, Office of 

Business Affairs, ADMN 321 Physics 

Fayetteville, AR 72701. Instrument: 

Electron Microscope. Manufacturer: FEI 

Inc., the Netherlands. Intended Use: The 

instrument will be used to complement 

the FEI instruments already installed at 

the facility, and be used to provide highresolution imaging, spectroscopy, and 

sample preparation capabilities. The 

instrument has a unique 5-axis 

motorized eucentric specimen stage 

which reads out and displays all 5 axes 

with an accuracy of 0.01 microns and 

0.01 degrees. Justification for Duty-Free 

Entry: There are no instruments of the 

same general category manufactured in 

the United States. Application accepted 

by Commissioner of Customs: January 

24, 2011. 

Docket Number: 11–015. Applicant: 

The Regents of the University of 

California, Lawrence Berkeley National 

Laboratory, 1 Cyclotron Road, M/S 

71R0259, Berkeley, CA 94720. 

Instrument: Electron Microscope. 

Manufacturer: Carl Zeiss SMT, Inc., 

Germany. Intended Use: The instrument 

will be used to investigate the structure 

and composition of inorganic, polymer 

and biological nano-materials. The 

instrument allows for the employment 

of transmission microscopy techniques, 

such as high-resolution imaging and 

tomography, cryo-imaging, energyfiltered imaging, energy loss 

spectroscopy and selected-area 

diffraction. It meets the necessary 

specifications of the research, including 

stability of sample stage and image with 

respect to thermal drift and external 

vibration, flexibility of stage motions, 

flexibility of software for signal 

acquisition and image processing, 

overall system stability, and ease of use. 

Justification for Duty-Free Entry: There 

are no instruments of the same general 

category being manufactured in the 

United States. Application accepted by 

Commissioner of Customs: December 7, 

2010. 

Dated: February 23, 2011. 

Gregory Campbell, 

Director, IA Subsidies Enforcement Office. 

[FR Doc. 2011–4515 Filed 2–28–11; 8:45 am] 

BILLING CODE 3510–DS–P 

DEPARTMENT OF COMMERCE 

International Trade Administration 

Application(s) for Duty-Free Entry of 

Scientific Instruments 

Pursuant to Section 6(c) of the 

Educational, Scientific and Cultural 

Materials Importation Act of 1966 (Pub. 

L. 89–651, as amended by Pub. L. 106– 

36; 80 Stat. 897; 15 CFR part 301), we 

invite comments on the question of 

whether instruments of equivalent 

scientific value, for the purposes for 

which the instruments shown below are 

intended to be used, are being 

manufactured in the United States. 

Comments must comply with 15 CFR 

301.5(a)(3) and (4) of the regulations and 

be postmarked on or before March 21, 

2011. Address written comments to 

Statutory Import Programs Staff, Room 

3720, U.S. Department of Commerce, 

Washington, DC 20230. Applications 

may be examined between 8:30 a.m. and 

5 p.m. at the U.S. Department of 

Commerce in Room 3720. 

Docket Number: 10–034. Applicant: 

University of Colorado, 12801 E. 17th 

Ave., RC1 South, Rm 10101, Box 6511, 

Mailstop 8101, Aurora, CO 80045. 

Instrument: Singer MSM System 

300TSA. Manufacturer: Singer 

Instrument Co. Ltd., United Kingdom. 

Intended Use: The instrument will be 

used to manipulate yeast cells and 

spores for genetic analysis and 

construction of strains with particular 

mutations, pedigree analysis, cell and 

zygote isolation and cell cycle and cell 

aging studies. The instrument consists 

of a micromanipulator device attached 

to a microscope with a computerized 

stage that allows the user to keep track 

of the position. It also has a CCD camera 

video monitor that reduces the eye 

strain caused by prolonged peering 

through microscope objectives. The 

components of this instrument are 

specifically designed for work with 

yeast cells. This instrument is unique 

because it has a motorized stage, which 

can be programmed to automatically 

move to predetermined positions, and 

the joystick electronic. Justification for 

Duty-Free Entry: There are no 

instruments of the same general 

category being manufactured in the 

United States. Application accepted by 

Commissioner of Customs: January 12, 

2011. 

Docket Number: 10–077. Applicant: 

University of Chicago LLC, Operators of 

Argonne National Laboratory, 9700 

South Cass Ave., Lemont, IL 60439. 

Instrument: Batch Furnace. 

Manufacturer: NGK Insulators Ltd., 

Japan. Intended Use: The instrument 

will be used in the synthesis of cathode 

materials for lithium ion batteries. In 

particular, the instrument will be 

applied during the last step of the 

synthesis—the calcination of the 

cathode material. The techniques used 

in calcinations are very dependent on 

the calcination furnace. This 

instrument’s furnace allows for heating 

in oxygen flow. The uniformity of 

heating and oxygen flow is critical to 

obtain the cathode material because the 

temperature, together with the oxygen 

flow, ensures the removal of aqueous 

residues on the material. The material 

must be free of water because lithium 

and water can react and have fatal 

consequences. This batch furnace 

includes high distribution of the sample 

(multiple trays), which allows for faster 

drying and greater uniformity than a 


jlentini on DSKJ8SOYB1PROD with NOTICES