JNTUA B.Tech. R20 Regulations

########## JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY ANANTAPUR B.Tech III-I Sem L T P C 3 0 0 3 (20A56501) MATERIALS CHARACTERIZATION TECHNIQUES (Open Elective- I) : Course Objectives

- • To provide an exposure to different characterization techniques.
- • To enlighten the basic principles and analysis of different spectroscopic techniques.
- • To explain the basic principle of Scanning electron microscope along with its limitations and applications.
- • To identify the Resolving power and Magnification of Transmission electron microscope and its applications.
- • To educate the uses of advanced electric and magnetic instruments for characterization.

########## Course Outcomes

: At the end of the course the student will be able

- • To explain the structural analysis by X-ray diffraction.
- • To understand the morphology of different materials using SEM and TEM.
- • To recognize basic principles of various spectroscopic techniques.
- • To study the electric and magnetic properties of the materials.
- • To make out which technique can be used to analyse a material

########## UNIT I

Structure analysis by Powder X- Ray Diffraction: Introduction, Bragg's law of diffraction, Intensity of Diffracted beams, Factors affecting Diffraction, Intensities, Structure of polycrystalline Aggregates, Determination of crystal structure, Crystallite size by Scherrer and Williamson-Hall (W-H) Methods, Small angle X-ray scattering (SAXS) (in brief).

########## UNIT II

Microscopy technique -1 - Scanning Electron Microscopy (SEM) Introduction, Principle, Construction and working principle of Scanning Electron Microscopy, Specimen preparation, Different types of modes used (Secondary Electron and Backscatter Electron), Advantages, limitations and applications of SEM.

########## UNIT III

Microscopy Technique -2 - Transmission Electron Microscopy (TEM): Construction and Working principle, Resolving power and Magnification, Bright and dark fields, Diffraction and image formation, Specimen preparation, Selected Area Diffraction, Applications of Transmission Electron Microscopy, Difference between SEMand TEM, Advantage and Limitations of Transmission Electron Microscopy.

########## UNIT IV

Spectroscopy techniques - Principle, Experimental arrangement, Analysis and advantages of the spectroscopic techniques - (i) UV-Visible spectroscopy (ii) Raman Spectroscopy, (iii) Fourier Transform infrared (FTIR) spectroscopy, (iv) X-ray photoelectron spectroscopy (XPS).

########## UNIT V

Electrical & Magnetic Characterization techniques: Electrical Properties analysis techniques (DC conductivity, AC conductivity) Activation Energy, Effect of Magnetic field on the electrical properties (Hall Effect). Magnetization measurement by induction method, Vibrating sample Magnetometer (VSM) and SQUID.

########## Textbooks:

- 1. Material Characterization: Introduction to Microscopic and Spectroscopic Methods - Yang

Leng - John Wiley &Sons (Asia) Pvt. Ltd. 2008 2. Handbook of Materials Characterization -by Sharma S. K. - Springer

########## References:

- 1. Fundamentals of Molecular Spectroscopy - IV Ed. - Colin Neville Banwell and Elaine M.

McCash, Tata McGraw-Hill, 2008. 2. Elements of X-ray diffraction - Bernard Dennis Cullity& Stuart R Stocks, Prentice Hall, 2001 3. Materials Characterization: Introduction to Microscopic and Spectroscopic Methods-Yang Leng- John nd iley& Sons4. Characterization of Materials 2 Edition, 3 Volumes-Kaufmann E N -John Wiley (Bp)

########## JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY ANANTAPUR