Public procurement notice: Voluntary Ex Ante Transparency Notice
Published: 2018-09-06
Buyer: University of Copenhagen
Country: DK
Contract type: Supplies
Procedure: Negotiated without a prior call for competition
CPV classification: 33111000: X-ray equipment | 38430000
Estimated value: 1850000 DKK

Technical requirements: The acquisition of an X-ray diffractometer for powder diffraction and total scattering to the Department of Chemistry / Nanochemistry Section, University of Copenhagen.
The acquisition concerns an in-house powder x-ray diffractometer with exchangeable Ag and Cu X-ray tube configurations, equipped with an X-ray detector with high spatial resolution and high sensitivity to both Cu and Ag K alpha radiation, designed for laboratory scale measurements.
The instrument is to be used for X-ray total scattering measurements for Pair Distribution Function (PDF) analysis as well as Powder X-ray Diffraction measurements for Rietveld analysis. It will be applied to characterize nanoparticle structure in our research in structure/size relations in advanced energy materials. The diffractometer will be in use daily for sample characterization.
The X-ray total scattering measurements for PDF analysis require high X-ray energy to reach sufficient momentum transfers (Q > 20 Å-1), hence the need of the Ag X-ray tube. In order to ensure high quality, rapid measurements for detailed analysis, a detector that has high sensitivity (100 %) to high energy X-rays, high spatial resolution, and low background is required. The Cu X-ray tube will be used for complementary powder X-ray measurements for Rietveld refinement, and the detector must therefore also be sensitive to Cu radiation. The diffractometer must be configured so that the Cu and Ag configurations can easily be exchanged.
The Contracting Authority is The Department of Chemistry which is an institute of the University of Copenhagen. The diffractometer will be installed in the laboratories of the Nanostructure research group within the Nanochemistry section. The research group performs both teaching and research within the fields of nanostructure and materials chemistry.
The X-ray diffractometer must feature exchangeable Ag and Cu X-ray tubes, as well as an area detector system with high spatial resolution (specified below) and 100 % efficiency towards both Ag and Cu K alpha X-ray radiation, i.e. a CdTe sensor. The PDF analysis requires that the measurements feature low background noise, < 6 counts/second.
The area detector must have high spatial resolution (maximum 60 micron pixel size, > 400 by 440 pixel array for diffraction measurements, with 1 pixel point spread function). The CMOS VLSI readout chip must have an active area of at least 30,06 × 24,16 mm
High count rate linearity for a large dynamic range is required (99 % count rate linearity to 3 900 000 000 CPS on the detector).
The detector must have scanning and static 1D functionality, and scanning and static 2D functionality: Static 2 theta range of 6.8 degrees at standard 240 mm radius and 10,6 degrees or 29,4 degrees static 2 theta range with optional radius reduction interfaces.
The only instrument that currently fulfills all above requirements is the Malvern Panalytical Empyrean diffractometer equipped with the Galipix detector.


Winner: Malvern Panalytical B.V
Award value: 1850000