Public procurement notice: Voluntary Ex Ante Transparency Notice
Published: 2020-11-13
Buyer: Aarhus Universitet
Country: DK
Contract type: Supplies
Procedure: Negotiated without a prior call for competition
CPV classification: 33000000 | 38000000
Estimated value: 336773 EUR

Technical requirements: The Department of Physics and Astronomy at Aarhus University wishes to purchase an atomic force microscope (AFM) for the measurement of 2D materials in an inert environment (glovebox). We aim to purchase an AFM that will allows us to visualize the atomic structure as well as the electronic and magnetic properties of layered 2D materials including topological and hybrid quantum systems.
2D materials and their hybrid structures have demonstrated potential for a wide variety of applications. However, many of these materials are air-sensitive and are prepared by mechanical exfoliation inside a glovebox under a well-controlled environment. With the purchased AFM we will study electronic and magnetic properties of these materials at the nanoscale with the aim to control/modify their properties using external stimuli, such as electric fields. Additionally, we will study the intrinsic as well as controllably induced defects in gapped 2D systems. These defects may represent missing or substituted atom in an otherwise perfect lattice and thus we require spatial resolution at the atomic scale. Such defects have potential to be used as single photon sources (quantum emitters) for quantum photonics/communications and other quantum applications.
Above mentioned requirements demand an AFM with very specific features and capabilities. In particular easy operation and atomic scale resolution inside a glovebox; and the ability to upgrade AFM with advanced modules without any major modification to the system are the most important requirements.
1) The AFM should be specifically designed for atomic resolution imaging in air as well as in liquid in ‘closed-loop-mode’ in all three axes;
2) The AFM must routinely achieve atomic resolution in a glovebox environment. The required AFM should therefore have its own integrated integrated high voltage capabilities;
3) The AFM must have a small footprint (no larger than 40 cm wide x 50 cm deep) to allow sufficient space for other equipment in the glovebox;
4) The AFM must scan the sample in the X,Y and Z directions during imaging. The probe must remain stationary during imaging relative to the frame of the AFM;
5) The AFM must have integrated high voltage capabilities for applying voltages up to +/- 150V to the sample;
6) The AFM must allow highly modular, user-exchangeable light sources for the cantilever deflection detection system and available options for these sources must include:
7) Laser spot positioning and photodetector adjustments must be motorized and controlled through software;
9) The AFM must operate at both conventional scan speeds (e.g. 1-2 Hz line scan rates) and the same AFM and scanner must also qualify as a ‘fast scanning’ AFM (at least 40Hz);
10) In ‘fast scanning’ imaging the AFM must support for a wide range of modes, including at minimum: tapping mode, contact mode, bimodal AFM (sometimes known as Dual AC), electric force microscopy, kelvin probe force microscopy, lateral force microscopy, loss tangent imaging mode, magnetic force microscopy, and piezoresponse force microscopy;
11) When configured for both conventional speed and ‘fast scanning’ imaging, the AFM must support XY scan sizes up to at least 30 microns and Z ranges of at least 5 microns;
12) The AFM must include a photothermal cantilever drive function to excite the cantilever resonance in AC mode (tapping mode);
13) It must be possible to upgrade the AFM to a ‘video-rate AFM’ — defined as an AFM capable of imaging in AC mode (tapping mode) with line scan rates up to at least 1200 Hz;


Winner: Oxford Instruments Asylum Research Inc
Award value: 336773