Scanning Probe Microscopy Lecture #3 AFM
Channel: Magnus Hummelgård
Date: 2014-10-20

This is the third lecture on scanning probe microscopy, here I discuss different artifacts that can appear in the scanned image. Piezo-hysteresis, wrong regulation settings, contaminated tips, and tip-size effects are mentioned.
Your guide: Magnus Hummelgård.

Playlist with all the materials characterization videos
https://www.youtube.com/watch?v=bjNTfHlZW98&list=PLwCFBj9ZpOBbVW04LGO9UoXQPLUe9BtqG