Scanning Probe Microscopy Lecture #2 AFM
Channel: Magnus Hummelgård
Date: 2014-10-20

This is the second lecture on scanning probe microscopy, here I discuss the atomic force microscope, AFM, comparison to the scanning tunneling microscope, its force measurement capabilities
and the general technique behind it, and its scanning modes: contact mode and non-contact mode.
Your guide: Magnus Hummelgård.

Playlist with all the materials characterization videos
https://www.youtube.com/watch?v=bjNTfHlZW98&list=PLwCFBj9ZpOBbVW04LGO9UoXQPLUe9BtqG