Time Of Flight-Secondary Ion Mass Spectrometry: Overview And Forensic Applications | Paper 6
Channel: Forensic 365
Date: 2021-12-27

Time of Flight-Secondary ion Mass Spectrometry is a surface-sensitive analytical method that has been proved to be successful in the analysis of a wide range of forensic evidence such as Toxicological samples, Gunshot residues, Fingerprints, Hairs, Glass, Dyes &amp; Inks, Questioned documents and cosmetics. The technique can provide qualitative information in spatially resolved visualization of structures and trace chemical residues in very complex samples.

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