Understanding and Modeling On-Die Error Correction in Modern DRAM - Minesh Patel
Channel: Minesh Patel
Date: 2019-06-27

Talk given at the 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2019), Portland, OR, USA, June 2019. 

"Understanding and Modeling On-Die Error Correction in Modern DRAM: An Experimental Study Using Real Devices" 

Presenter: Minesh Patel 
Paper: https://people.inf.ethz.ch/omutlu/pub/understanding-and-modeling-in-DRAM-ECC_dsn19.pdf 

Paper appears in the Proceedings of the 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2019), Portland, OR, USA, June 2019. 

Slides (pptx): https://people.inf.ethz.ch/omutlu/pub/EIN-understanding-and-modeling-in-DRAM-ECC_dsn19-talk.pptx
Slides (pdf): https://people.inf.ethz.ch/omutlu/pub/EIN-understanding-and-modeling-in-DRAM-ECC_dsn19-talk.pdf