Integrated Circuits Testing: Passive Devices
Channel: AIM Photonics
Date: 2021-10-15

Prof. Hu (MIT) reviews test characterization methods for passive integrated photonics components, including fiber-to-chip coupling schemes, waveguides, spirals, Mach Zehnder Interferometers, Y-splitters, ring resonators, and directional couplers. Waveguide characterization will focus on loss and dispersion measurements, and examine wavelength and polarization dependencies. Prof. Jaime Cardenas (U of Rochester) will offer his expertise in Design for Manufacturing (DfM) and testing at a wafer-scale. Register now!
https://www.aimphotonics.com/online-courses