Atomic Force Microscopy / AFM.. Nanoscience and Nanotechnology.. @G.T.ScienceTutorial
Channel: GT Science Tutorial
Date: 2021-02-16

#Atomic_Force_Microscopy #ProbeMicroscopy 

Atomic Force Microscopy is the best and most unsed characterization technique for nanomaterials. The limitations of SEM, TEM and STM is overcomed by this process.

AFM is a part of Scanning probe Microscopy. STM is also a part of probe Microscopy but in STM, Tunneling currently between tip and sample is measured and for that sample must be conductive. And non conductive can not be characterized by STM... But AFM, on the other hand is capable of characterizing any type of sample, either that is hard or soft or powdered or wet or conductive or non conductive.. So this process is quite acceptable...


In this video I have explained everything relating AFM. First of all I have explained why AFM is better that other techniques then I have explained about the modes of operation of AFM. The modea of operations of AFM are,
1) Contact mode.
2) Non Contact mode.
3) Tapping mode.

After modes of operation I have explained about what are the sample requirements and informations that can be obtained from it.
As a whole, this video has everything you need to know.. By watching this video,  you can be able to understand know everything about AFM..

Scanning Electron Microscopy (SEM)
https://youtu.be/ZHOI8f6kCfc

Transmission Electron Microscopy (TEM)
https://youtu.be/IAzM9TJ0DQM

Scanning Tunneling Microscopy (STM)
https://youtu.be/Ehdc_heXJo0

Nanoindentation 
https://youtu.be/gjqG-voAems

Presented by Govinda Thakur
BSc Chemistry
Tribhuwan University

Email: govindathakur2055@gmail.com 
WhatsApp: 9827348523
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