Introduction to Quantitative Analysis using NIST DTSA-II
Channel: Nicholas Ritchie
Date: 2018-09-19

An introduction to quantifying X-ray spectra using NIST DTSA-II.  NIST DTSA-II supports quantifying electron-generated x-ray spectra ("SEM-EDS") using locally collected standard spectra. This video presents a simple example.  NIST DTSA-II is available for free from https://www.cstl.nist.gov/div837/837.02/epq/dtsa2/index.html