In-Chip Sensing and PVT Monitoring -- Synopsys
Channel: EE Journal
Date: 19/03/2021

March 19, 2021 -- In-chip monitoring can significantly alter the lifecycle management landscape. By taking advantage of modern techniques, today’s more complex designs can be optimized even after they are deployed. In this episode of Chalk Talk, Amelia Dalton chats with Stephen Crosher of Synopsys about silicon lifecycle management and how to take full advantage of the optimization opportunities available for scalability, reliability, and much more.
More information about In-chip monitoring and sensing: https://bit.ly/3r3VIrO 
Watch the first episode in this series: https://bit.ly/2Q2EDlg