ZEISS Xradia Versa with FPX Larger samples, higher throughput Image 4" whole core samples to classify rock into litho- logies for mechanical sampling, upscaling and down- scaling ZEISS FPX workflow: li-ion battery from macro to nano scale
ZEISS FPX: A world-class flat panel
system for ZEISS Xradia Versa
FPX™ flat panel extension for the Xradia Versa 500-series of 3D X-ray microscopes delivers large-sample, high throughput scan- ning with ZEISS best-in-class image quality. Combined with the well-known high resolu- tion of Xradia Versa X-ray microscopes (XRM), FPX expands your imaging flexibility and speed, providing workflow efficiencies in an all-in-one system whether your require- ments are for industrial or academic research. R&D, process development or failure analy- sis, raw materials characterization, or multi- disciplinary central imaging labs will all benefit from an increased operating space for imaging that accommodates a greater variety of sample sizes.
Extend the Scout-and-Zoom workflow
The Scout-and-Zoom technique enabled by RaaD, or resolution at a distance, core technology of the Xradia Versa microscope, is broadened by the FPX system. Users can begin their exploration with a larger sample, performing a fast, full field of view, high quality scan to accurately locate the region of interest for further interrogation with a high-resolution RaaD objective.
Perform large sample, high quality
imaging
FPX employs a 3072 x 1944 pixel detector apable of scanning samples 140 mm wide and 165 mm high with vertical stitching, 93 mm high without. Precision stage con- trols allow the user to adjust source/sample/ detector distances for optimal resolution and field of view. FPX increases the operating window of the Versa system for large samples while upholding the well-regarded ZEISS image quality.
More scans in less time
For heavily-loaded service labs or production- line quality inspection, FPX is configured for throughput. Imaging parameters may be adjusted to reduce scan times and still pro- vide the image quality necessary to achieve your feature detection goals. Customers benefit by performing more scans in less time, reducing cost per scan and the total cost of ownership of their Xradia Versa 3D X-ray microscope.

Features
■ Optional addition to 500-series Xradia Versa 3D X-ray microscopes: FPX complements high resolution Versa RaaD objectives ◾ Increased imaging range for larger samples: over 10x greater reconstruction volume ■ Higher throughput: 2-5x greater ■ Integrated into Scout-and-Scan™ control software for seamless objective exchange ◾ Broadening the Scout-and-Zoom™ macro- scopic > nanoscopic imaging workflow
Applications
Electronics, Automotive & Medical
Device Industries
Image fine details seamlessly from system to components with an all-in-one tool to enhance efficiency. Scan an entire intact device, then zoom to a processor or battery module, and finally to interconnect or material structure.
Oil & Gas, Mining & Other Raw Materials
Rapidly image large samples to knowledge- ably define location for high resolution interior tomography. This enables a workflow that allows you to characterize heterogeneity, without mechanical sampling, at a level not previously possible. Characterize and model reservoir samples from 4" core to sub-micron scale with high throughput.
Materials Science
Non-destructively locate regions of interest, providing intelligent navigation for high resolution interior tomography. Your central imaging facility will benefit from higher throughput and an increased operating range for larger samples. FPX expands the capacity of Xradia Versa X-ray microscopes to accommodate a broad range of samples, serving both academic and industrial customers.
Life and Archival Sciences
Image entire intact specimens without physical sectioning by taking advantage of the increased sample size capability. Improve the richness and scope of your imaging data while reducing acquisition time for your precious samples. for therapeulc, treatment or medical dagnosic evidence. Not all products are available in every country. Contect you local ZEISS representative
44_012_034| CZ 03-2016| Desig microscopy@zeiss.com www.zeiss.com/xrm