[23][24][2007]"Topographic Study of Dislocation Structure in Hexagonal SiC Single Crystals with Low Dislocation
Density"
D. Nakamura, S. Yamaguchi, I. Gunjishima, Y. Hirose, T. Kimoto
Journal of Crystal Growth, 304, (2007), 57-63"First-principles Calculation and X-ray Absorption Fine Structure Analysis of Fe Doping Mechanismfor Semi-insulating GaN Growth on GaAs Substrates"
R. Togashi, F. Satoh, H. Murakami, J. Iihara, K. Yamaguchi, Y. Kumagai, A. Koukitu
Physica Status Solidi B, 244, (2007), 1862-1866

BL16XU
Refereed Journals
[1]

[2]

[3]

Contract Beamlines

[4]

[5]

[6]

[7]

[8]

[9]

[10]

[11]

[2000]"Wavelength-Dispersive Total Reflection X-Ray Fluorescence with High-Brilliance Undulator
Radiation at SPring-8"
N. Awaji, S. Ozaki, J. Nishino, S. Noguchi, T. Yamamoto, T. Shoji, M. Yamagami, A. Kobayashi, Y.
Hirai, M. Shibata, K. Yamaguchi, K. Liu, S. Kawado, M. Takahashi, S. Yasuami, I. Konomi, S. Kimura,
Y. Hirai, M. Hasegawa, S. Komiya, T. Hirose, T. Okajima
Japanese Journal of Applied Physics, 39, (2000), L1252-L1255[2001]"Microscopic Observation of Cu Damascene Interconnect Grains Using X-Ray Microbeam"
M. Hasegawa, Y. Hirai
Journal of Applied Physics, 90, (2001), 2792-2795[2002]"Tetragonal Distortion of c Domains in Fatigued Pb(Zr,Ti)O3 Thin Films Determined by X-Ray
Diffraction Measurements with Highly Brilliant Synchrotron Radiation"
S. Kimura, K. Izumi, T. Tatsumi
Applied Physics Letters, 80, (2002), 2365-2367[2003]"Influence of Dissolved Hydrogen on Structure of Oxide Film on Alloy 600 Formed in Primary Water ofPressurized Water Reactors"
T. Terachi, N. Totsuka, T. Yamada, T. Nakagawa, H. Deguchi, M. Horiuchi
Journal of Nuclear Science and Technology, 40, (2003), 509-516[2004]"Capturing Characteristic of Gaseous Mercury in Desulfurization Solutions Simulating theLimestone-Gypsum Process"
H. Akiho, M. Nunokawa, H. Shiraiᣣᧄࠛࡀ࡞ࠡ࡯ቇળ⹹ (Journal of the Japan Institute of Energy), 83, (2004), 924-931"Wavelength Dispersive Grazing Incidence X-ray Fluorescence of Multilayer Thin Films"
N. AwajiSpectrochimica Acta part B, 59, (2004), 1133-1139"The Design and Performance of Beamline BL16XU at SPring-8"
Y. Hirai, S. Yasuami, A. Kobayashi, Y. Hirai, J. Nishino, M. Shibata, K. Yamaguchi, K. Liu, S. Kawado,T. Yamamoto, S. Noguchi, M. Takahashi, I. Konomi, S. Kimura, M. Hasegawa, N. Awaji, S. Komiya, T.
Hirose, S. Ozaki, T. Okajima, T. Ishikawa, H. Kitamura
Nuclear Instruments and Methods in Physics Research Section A, 521, (2004), 538-548"Submicron-Resolved X-ray Topography using Asymmetric-Reflection Magnifiers"
R. Tanuma, M. OhsawaSpectrochimica Acta Part B, 59, (2004), 1549-1555[2005]"In situ X-ray Diffraction Study of Crystallization Process of GeSbTe Thin Films during HeatTreatment"
N. Kato, I. Konomi, Y. Seno, T. Motohiro
Applied Surface Science, 244, (2005), 281-284"Crystallographic Analysis of CoPtCr-SiO2 Perpendicular Recording Media with High Anisotropy using
Synchrotron Radiation X-ray Diffraction"
T. Kubo, Y. Kuboki, M. Ohsawa, R. Tanuma, A. Saito, T. Oikawa, H. Uwazumi, T. Shimatsu
Journal of Applied Physics, 97, (2005), 10R510"Study on Fabrication Process of GaAs Electronic Devices"
Y. Saito
Doctor Thesis (The University of Tokyo), (2005), 1-140

BL16XU

́298́
− 296
−

[13]

[14]

[15]

[16]

[17]

[18]

"X-ray Absorption and Emission Spectroscopy at the Hf-L1 Edge of Hafnium-(Silicon)-Oxide Ultra-Thin
Film"
Y. Uehara, K. Kawase, J. Tsuchimoto, T. Shibano
Journal of Electron Spectroscopy and Related Phenomena, 148, (2005), 75-79[2006]"Effect of Depth Profile of Residual Stress on Milling Performance of TiAlN Coating"
H. Fukui, S. Imamura, K. Yamaguchi, J. Iihara⎎☸ടᎿቇળ⹹ (Journal of the Japan Society of Grinding Engineers), 50, (2006), 718-722"Study of Stacking Fault Effect on Magnetic Anisotropy of CoPtCr SiO2 Perpendicular Media bySynchrotron Radiation X-ray Diffraction"
T. Kubo, Y. Kuboki, R. Tanuma, A. Saito, S. Watanabe, T. Shimatsu
Journal of Applied Physics, 99, (2006), 08G911"Soft Synthesis of Single-Crystal Silicon Monolayer Sheets"
H. Nakano, T. Mitsuoka, M. Harada, K. Horibuchi, H. Nozaki, N. Takahashi, T. Nonaka, Y. Seno, H.
Nakamura
Angewandte Chemie International Edition, 45, (2006), 6303-6306"Nondestructive Measurement of Hexavalent Chromium in Chromate Conversion Coatings Using
X-ray Absorption Near Edge Structure"
K. Nomura, N. Awaji
Japanese Journal of Applied Physics, 45, (2006), L304-L306"Fresnel-Zone-Plate-Magnified X-ray Topography"
R. Tanuma, T. Kubo
Japanese Journal of Applied Physics, 45, (2006), 5280-5282[2007]"Soft X-ray Resonant Magnetic Reflectivity Study on Induced Magnetism in [Fe70Co30/Pd]nSuper-Lattice Films"
N. Awaji, K. Noma, T. Hirono, H. Kimura, K. Nomura, S. Doi, T. Nakamura
Journal of Physics: Conference Series, 83, (2007), 012034

BL22XU
Refereed Journals
[1]

[2]

[3]

[4]

[5]

[6]

[7]

[8]

[2004]"Application of a Portable Pulsed Magnet to Synchrotron Radiation Experiments"
Y. Matsuda, Y. Ueda, H. Nojiri, T. Takahashi, T. Inami, K. Oowada, Y. Murakami, T. Arima
Physica B, 346-347, (2004), 519-523[2005]"Magnetic-Field-Induced Transition in the Lattice Modulation of Colossal Magnetoelectric GdMnO3and TbMnO3 Compounds"
T. Arima, S. Miyasaka, T. Goto, Y. Yamasaki, K. Ishii, T. Inami, M. Tsubota, Y. Murakami, Y. Tokura
Physical Review B, 72, (2005), 100102R"X-ray Diffraction Experiments under Pulsed Magnetic Fields above 30T"
T. Inami, K. Ohwada, Y. Matsuda, Y. Ueda, H. Nojiri, Y. Murakami, T. Arima, H. Ohta, W. Zhang, K.
Yoshimura
Nuclear Instruments and Methods in Physics Research Section B, 238, (2005), 233-236"Pressure-Induced Drastic Structural Change in Liquid CdTe"
T. Kinoshita, T. Hattori, T. Narushima, K. Tsuji
Physical Review B, 72, (2005), 060102"Resonant X-ray Scattering Study of UNiGa5"
K. Kuzushita, K. Ishii, K. Ohwada, Y. Murakami, K. Kaneko, N. Metoki, G. Lander, S. Ikeda, Y. Haga,Y. Onuki
Physica B, 359-361, (2005), 1045-1047[2006]"Single Crystal Synchrotron X-Ray Diffraction Study under Pressure in UGe2"
N. Aso, K. Oowada, T. Watanuki, A. Machida, A. Ohmura, T. Inami, Y. Homma, Y. Shiokawa, K.
Hirota, N. Sato
Journal of the Physical Society of Japan, 75, (2006), 88-90"Pressure-induced Structural Change of Liquid CdTe up to 23.5 GPa"T. Hattori, T. Kinoshita, T. Narushima, K. Tsuji, Y. Katayama
Physical Review B, 73, (2006), 054203"Does Bulk Metallic Glass of Elemental Zr and Ti Exist?"
T. Hattori, H. Saitoh, H. Kaneko, Y. Okajima, K. Aoki, W. Utumi
Physical Review Letters, 96, (2006), 255504

́299́
− 297
−

BL22XU

Contract Beamlines[12]