Synos

GENERAL-PURPOSE SYSTEM SOLUTION / EF analysis and EAF analysis
EF (ENCIRCLED FLUX) ANALYSIS SYSTEM & EAF (ENCIRCLED ANGULAR FLUX) ANALYSIS SYSTEM
Rapid evaluation of encircled ﬂux and encircled angular ﬂux parameter of multi-mode optical ﬁber.

EF (Encircled Flux) and EAF (Encircled Angular Flux) measurement system is to measure
the mode diﬀusion of GI/SI type multimode optical ﬁbers with image processing of NFP and FFP
images. NFP measurement optics M-Scope type S/L and FFP measurement optics
M-Scope type F/FW are used as measurement optics. EF/EAF measurement can be performed
quickly and easily by optical beam analysis software Optometrics BA Standard.
☞Technical information【EF (Encircled Flux)・EAF (Encircled Angular Flux) analysis】○EF/EAF analysis
Since the loss of multimode optical ﬁber changes depending on the launch condition, it is necessary tospecify the launch condition during measurement. EF/EAF analysis is used as a new measurement method
to deﬁne its launch condition. In particular, EF/EAF analysis plays an important role in high-speed●NFP/EF measurement system
multimode optical ﬁber transmission.
○EF (Encircled Flux) analysis'EF' is the value obtained by analyzing the NFP image of the end face of optical ﬁbers and integrating thedistribution of beam intensity from the center toward the outer periphery. It is an index that shows what
proportion of the mode distribution to the total intensity exists in the range from the center to the radius(r),and is shown in the following ﬁgure, calculation formula, and graph.
○EAF (Encircled Angular Flux) analysis'EAF' is the value obtained by analyzing output FFP image of optical ﬁbers and integrating the intensity
distribution of the output angle from the center toward the spread direction (N.A.) of the output angle, andis shown in the following ﬁgures, formulas and graphs.
○EF/EAF analysis and type of optical ﬁber to be measured
Generally, EF analysis is applied to GI type (graded index type optical ﬁber), and EAF analysis is applied toSI type (step index type optical ﬁber).
●FFP/EAF measurement system○Measurement standard
In order to support high-speed transmission such as 10 Gbps, encircled ﬂux measurement method isspeciﬁed by IEC61280-1-4 as a new method for deﬁning the excitation conditions for GI type multimodeoptical ﬁbers. On the other hand, regarding SI type multimode optical ﬁber, encircled angular ﬂux
measurement method is speciﬁed in IEC61300-3053.
【Figure, formula, graph of EF/EAF analysis】

Center●EF/EAF analysis

RADIUS (r) [µm]●EF/EAF formula●EF graph*horizontal axis: radius(r)Half Angle [degree]●EAF graph*horizontal axis: half angle(degree)【Features】○Realization of quick and easy EF/EAF measurement by dedicated optics and image processing method○Possible to measure in 400nm to 1700nm wavelength range by selecting detector.
○Optical beam analysis module AP013, specially designed high functional image processing software for beam proﬁle analysis● All-in-one package of PC, optical beam analysis software, detector driver, correction data.
● High-performance image processing software for optical beam proﬁle measurement Optimetrics BA Standard is pre-installed.
In addition to the general-purpose beam proﬁler analysis function, EF/EAF measurement function is enhanced and standardized
parameter measurement function is installed.
○Optional special launch system (underﬁlled launch optics, mode-selective launch system), mode conditioner, and various lightsources are also available【Component selection of EF/EAF measurement system】○Stages・optics bench○Optics selection●for EF measurement

Optics bench for ﬁbermeasurement○Light source etc.
●Underﬁlled launch optics●Mode-selective launchoptics●Mode conditioner

Sophisticated NFP meas. optics
M-Scope type S・option
Coaxial epi-illumination port
MS-OP011-CEP●for EAF measurement

FFP measurement optics
M-Scope type FSLD light source
LD light source etc.

https://www.synos.jp○Detector selection●for visible~1100nm

High resolution CMOS
detector ISA071●for 950~1700nm

InGaAs high sensitivity NIR
detector ISA041H2●for 400~1700nm

InGaAs high resolution NIR
detector ISA041HRA/HRVA

20○Optical beam analysis module AP013●Personal computer
・Main unit
・Accessories●Optical beam analysis software
Optometrics BA Standard●Detector driver●Calibration data●USB licence key○Accessories
Objective lens (M-Scope type S)
Coaxial epi-illumination system（M-Scope type S）
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