OPTICAL BEAM MEASUREMENT OPTICS / FFP, N.A., BEAM DIVERGENCE ANGLE MEASUREMENT
M-Scope type FSynos

FFP (FAR FIELD PATTERN) MEASUREMENT OPTICS

Far-ﬁeld pattern measurement optics using optical method. Realtime measurement in combination with dedicated optics and image analysis.

M-Scope type F is specially-designed optics for optical method FFP (Far-Field Pattern)measurement. It is possible to analyze beam divergence angle distribution in real time.
【Features】○Specially designed optics for real-time observation and analysis of FFP○Long working distance design of approx. 6 mm.
○Possible to measure in 400nm to 1700nm wavelength range by selecting detector.
○High-performance FFP measurement system can be constructed by using Synos'
optical beam analysis module AP013 together.
【Optics selection】○for 650~1700nm○for 400~650nm

M-Scope type F
M-Scope type F/BL

M-Scope type FW

WIDE AREA FFP (FAR FIELD PATTERN) MEASUREMENT OPTICS【Available detectors selection】【Summary of speciﬁcations】○Measurement method: Dedicated f-θ optics & image processing ○for 400~1100nm: Hi-resolution CMOS detector ISA071, ISA071GL○for 950~1700nm: InGaAs NIR detector ISA041H2○Measurement light ﬂux diameter: Approx. 1mmφ○for 400~1700nm: InGaAs NIR derector ISA041HRA○W.D.:Approx. 6mm±0.8mm☞Regarding the measurement angle coverage and pixel resolution○Attenuate:
By neutral density ﬁlter
during FFP measurement by the detector used, please refer to P50○Camera mount:C mount【Detector selection and FFP measurement speciﬁcations】【Standard component】【Option】○Main optics:
1〇Accessories for optics○Optics base:1●ND ﬁlter, optics bench, etc.
Far-ﬁeld pattern measurement optics for measurable beam diameter 3mmφ. Applicable to the device with large light emitting area.

M-Scope type FW is specially-designed wide area type FFP optics with measurable
luminous ﬂux diameter of approx. 3mm φ.
【Features】○Covers a wide range of measurement luminous ﬂux diameters of approx. 3mmφ
○Wide measurement angle coverage of approx. ±43°○Specially designed optics for real-time observation and analysis of FFP○Long working distance of approx. 4mm○High-performance FFP measurement system can be constructed by using Synos'
optical beam analysis module AP013 together.
【Optics selection】* Please contact us regarding the measurement wavelength.
○for 650~1700nm
M-Scope type FW○for 400~650nm
M-Scope type FW/BL【Summary of speciﬁcations】【Standard component】○Measurement method: Dedicated f-θ optics & image processing ○Main optics:
1○Measurement light ﬂux diameter: Approx. 3mmφ
○Optics base:
1○W.D.:
Approx. 4mm±0.4mm【Option】○Attenuate:
By neutral density ﬁlter (dedicated〇Accessories for optics
35mmφ ND ﬁlter)●ND ﬁlter (dedicated 35mmφ）, optics bench, etc.
○Camera mount:C mount【Available detectors selection, measurement angle coverage, pixel resolution】
Detector model
Detector nameSpectral range
Sensor size
Total pixels
Pixels pitch
Measurement angle coverage
Pixel angle resolution

ISA061
1” Hi-resolution CMOS detector
400~1100nm
1 inch2048×2048
5.5μm
approx. ±43° / N.A. 0.68
approx. 0.05°

ISA041VH
VGA InGaAs high sensitivity NIR detector
950~1700nm
12.8mm×10.24mm
640×51220μｍ
approx. ±43°(H)×±40°(V)approx. 0.167°*Pixel angle resolution: The measurement angle corresponding to 1 pixel of the detector, calculated from the measurement
angle range and the pixel pitch of the detector.

☞Technical information【Principle of optical method (f-θ lens method) FFP measurement】

Samplef-θ lens

Field lens

Relay lensDetector

θhttps://www.synos.jp

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As shown in the ﬁgure on the left, the light ﬂux, having incident
angle θ from the sample, is focused at a point on the detector
through f-θ lens, ﬁeld lens and relay lens module. By this way,
FFP image of the sample is formed and acquired by imaging
detector, and analyzed directly and quickly by image processing
method.

SYNERGY OPTOSYSTEMS CO., LTD