OPTICAL BEAM MEASUREMENT OPTICS / NFP, OPTICAL BEAM PROFILE MEASUREMENT & ANALYSIS
M-Scope type S

Synos

SOPHISTICATED OPTICAL BEAM NFP MEASUREMENT OPTICSBest suit for optical beam pattern observation and analysis. Widely applied general purpose microscope-type NFP optics.

M-Scope type S is a high-performance optical system for optical beam observation,
beam proﬁle measurement and analysis, NFP measurement of laser diodes, opticalﬁbers, optical waveguides, and various light-emitting devices and modules.
【Features】○Equipped with manual 4-hole objective revolver as standard○Can be equipped with coaxial epi-illumination port (optional). Possible to observe real
microscopic image observation and positioning.
○Up to 200x optical magniﬁcation with 2x intermediate lens port (optional) and 100x
objective lens.
○Possible to measure in 400nm to 1700nm wavelength range by selecting detector.
○High-performance NFP measurement system can be constructed by using Synosʼ
optical beam analysis module AP013 together.
【Summary of speciﬁcations】○Mesurement method: Magnifying optics & image processing○Objective lens change: By manual revolver○Objective lens:
Mitsutoyo M-Plan Apo series○Intermediate lens:
1×○Maximum optical magniﬁcation: 100×（100× objectibe lens)○Epi-illumination:Option○Attenuate:
By neutral density ﬁlter○Camera mount:
C mount【Available detectors selection】○for 400~1100nm: Hi-resolution CMOS detector ISA071, etc.
○for 950~1700nm: InGaAs NIR detector ISA041H2, etc.
○for 400~1700nm: InGaAs NIR derector ISA041HRA, etc.
☞Regarding the ﬁeld of view and pixel resolution during NFP
measurement by the detector used, please refer to P50【Detector selection and NFP measurement speciﬁcations】

M-Scope type L【Option】○Option for M-Scope type S optics●2× intermediate lens port MS-OP011-RL2
Intermediate lens unit that doubles the overall magniﬁcationof the optical system. (up to 200× with 100× objective lens）●1/2× intermediate lens port MS-OP011-RLH
Intermediate lens unit that halves the overall magniﬁcationof the optical system.
●Coaxial epi-illumination port MS-OP011-CEP
Coaxial epi-illumination port with removable half mirror.
〇Accessories for optics●Objective lens, ND ﬁlter, coaxial epi- illumination light source,optics bench, etc.
【Standard component】○Main optics:
1○Optics base:
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SIMPLIFIED OPTICAL BEAM NFP MEASUREMENT OPTICS

Cost-eﬀective model of NFP optics with simpliﬁed functionality.

M-Scope type L is a simple functionality, less expensive model, without manual revolver
and LED coaxial epi-illumination port.
【Features】○Simple functionality, less expensive model, without manual revolver and coaxial
epi-illumination port.
○Possible to measure in 400nm to 1700nm wavelength range by selecting detector.
○NFP measurement system can be constructed by using Synosʼ optical beam analysis
module AP013 together.
○Easy to mount on various stages in a small housing.
【Summary of speciﬁcations】○Mesurement method: Magnifying optics & image processing○Objective lens change: By re-mounting objective lens○Objective lens:
Mitsutoyo M-Plan Apo series○Intermediate lens:
1×○Maximum optical magniﬁcation: 100×（100× objectibe lens)○Epi-illumination:
Not available○Attenuate:
By neutral density ﬁlter○Camera mount:
C mount【Standard component】【Available detectors selection】○Main optics:
1○for 400~1100nm: Hi-resolution CMOS detector ISA071, etc.
○Optics base:1○for 950~1700nm: InGaAs NIR detector ISA041H2, etc.
○for 400~1700nm: InGaAs NIR derector ISA041HRA, etc.
【Option】☞Regarding the ﬁeld of view and pixel resolution during NFP〇Accessories for optics
measurement by the detector used, please refer to P50●Objective lens, ND ﬁlter, optics bench, etc.
【Detector selection and NFP measurement speciﬁcations】☞Technical information【Simple structure of M-Scope type S】
Illumination light source

Objective lenslens for coaxial
epi-illumination

The measurement light emitted from the sample is magniﬁed by theﬁrst-stage objective lens and imaged on the image detector at thelatter stage of the optical system by the imaging lens. The captured
images are processed on a PC and analyzed for the emission beam
proﬁle, beam width, power distribution, etc. of the sample.

Imaging detector

Imaging lens

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