Synos

GENERAL-PURPOSE SYSTEM SOLUTION / FFP MEASUREMENT SYSTEM FOR LARGE LIGHT FLUXWIDE AREA FFP MEASUREMENT SYSTEM
FFP measurement and analysis system in combination with dedicated wide area FFP measurement optics & image processing method.

Wide area FFP measurement system is a radiation angle distribution (far ﬁeld pattern)measurement system that uses wide area FFP measurement optics M-Scope type FW with themeasurement target luminous ﬂux diameter of about 3 mm. It is suitable for FFP measurement,emission angle distribution measurement, N.A. measurement and analysis of beam emitted froma large area light emitting elements or large core optical ﬁbers.
【Features】○M-Scope type FW, wide area FFP measurement optics● Quick measurement by dedicated wide area f-θ lens optics and image processing method.
● Covers samples with a wide emission area with a luminous ﬂux diameter of about 3 mmφ.
● Long working distance design with the working distance of approx. 4mm±0.4mm.
○Possible to measure in 400nm to 1700nm wavelength range by selecting detector.
○Optical beam analysis module AP013, specially designed high-functional image processing
software for optical beam proﬁle analysis● All-in-one package of PC, optical beam analysis software, detector driver, correction data.
● High-performance image processing software for optical beam proﬁle measurement Optimetrics BA Standard is pre-installed.
【Standard component】○Wide area FFP measurement optics selection● 650~1700nm:
M-Scope type FW● 400~650nm:
M-Scope type FW/BL○Available detector selection● 400~1100nm︓
1” CMOS detector ISA061● 950~1700nm︓
VGA InGaAs NIR detector ISA041VH○Optical beam analysis module AP013● PC for image processing, optical beam analysis software
Optometrics BA Standard, detector driver, calibration
data, USB key○Accessories● Cables, instruction manuals, etc.

【Option】○Dedicated φ35mm ND ﬁlter● NIR (700~1100nm): NDF NIR35-5 (5 types per set)
● IR (1310~1550nm): NDF IR35-5（5 types per set）
○Optics bench● Optics bench for ﬁber measurement with manual stages● Vertical setting optics bench【Available detectors, angle coverage, pixel resolution (approx.)】Detector

1” CMOS detector
ISA061VGA InGaAs NIR detector
ISA041VHSpectral range

400~1100nm

950~1700nm

Total pixels

2048×2048 pixels

640×512 pixels

Pixels pitch

5.5μm sq.

20μm sq.

Meas. angle /Meas. angle

Resolution

Pixel resolution approx. ±43° approx. 0.05°
N.A. 0.68

Meas. angle

Resolution

approx. ±43° approx. 0.167°(H)×±40°(V)*Pixel resolution: Measured angle equivalent to the detector pixel calculated frommeasured angle range and sensor pitch of the detector.

【Component selection of wide area FFP measurement system】○Stages・optics bench
Sample stages
Optics stages○Wide area FFP measurement opticsselection○Optical beam analysis module AP013○Detector selection●Personal computer
・Main unit
・Accessories●for 400~1100nm

Optics bench for ﬁbermeasurement
Wide area FFP measurement optics
M-Scope type FW

Vertical setting
optics bench＊Can be combined with various
motorized/manual stages

https://www.synos.jp●M-Scope type FW (for 650-1700nm）●M-Scope type FW/BL (for 400-650nm）●Optical beam analysis software
Optometrics BA Standard●Detector driver●Calibration data●USB licence key

1” CMOS detector
ISA061●for 950-1700nm○Accessories
VGA InGaAs NIR detector
ISA041VH

35φ ND ﬁlter

SYNERGY OPTOSYSTEMS CO., LTD