Dynamic 41
digital detectors
Exclusive superior image quality X-ray detectors
for 2D radiographic inspection and 3D CT.

Improved cycle time
without image quality impact

Dynamic 41 detectors Powering the next generationof X-ray inspection and CT
The Dynamic 41|100 and Dynamic 41| 200p+ detectors are the first in Waygate Technologies next
generation industrial X-ray flat panel detector platform. The Dynamic 41|100 detector combines
superior image quality with improved detection speed at 410 x 410 mm² detection area and100 µm pixel size. It achieves 100 micron results at 200 micron efficiency and contrast-to-noise-ratio,
while the new Dynamic 41|200p+ detector increases industrial inspection speed by factor 2-3, allowing
high throughput fully automated CT on the production floor.
In its new p+ configuration, the Dynamic 41|200 comes standard with a new photodiode protection
coating, ensuring better radiation protection at same sensitivty - hence, significantly increasing thedetector lifetime at high energy inspection applications.
Based on exclusive X-ray detector technology, Waygate Technologies offers its first 100 µm, 16MPixel
detector designed exclusively for rough and high-energy industrial X-ray applications to its radiography
and CT customers. The EnduranceTM CsI scintillator offers superior resolution and brightness compared
to conventional GadOx or other powder based scintillators.

Key Applications Increasing industrial inspection
quality and productivity
The Dynamic 41 detectors demonstrate their excellent performance
especially at industrial CT for failure analysis and 3D metrology as
well as at 2D radiographic inspection of parts such as:• Aerospace and automotive castings• Additive manufactured and composite parts

100 µm imaging:See more to know more
The 5 US dollar bill comparison clearly visualizes the quality gain:
At identical kV parameters, the new Dynamic 41|100 detector provides doubled resolution at comparable
signal-to-noise-ratio and dynamic range.

Conventional DXR250 200 µm pixel detector

State of the art DXR flat panel detector with
200 µm pixel size

Dynamic 41|100 detector

Superior Dynamic 41|100 detector providing 100 µm
pixel size for superior image quality and doubled
resolution to detect two times smaller defects

Doubled productivity
at same quality level
Due to its equivalent or even higher sensitivity
compared to state of the art 200 µm pixelsize detectors,
the new Dynamic 41|100 detector allows a 2x resolution
increase without cycle time impact or comparable
result quality at significant reduced acquisition time
(Dynamic 41|100 & Dynamic 41|200p+).
The comparison below shows pores in a scanned
aluminum casting.

State of the art detector
DXR250 (200 µm pixel)

Baseline scan time

Advanced Dynamic 41 series		

Same quality level at half baselinescan time with Dynamic 41|100 andDynamic 41|200p+

Same scan time as baseline
but doubled resolution with 41|100

Doubled resolution
at same geometric magnification

Small sample

ROI 2

Large sample

Focus-Object-Distance (FOD)
Focus-Detector-Distance (FDD)

Scan resolution of ROI 1 is equivalent to ROI 2, but ROI 2 is 8 times larger due to smaller pixel
allowing scanning larger parts with smaller magnification.

ExclusivenessThe new Dynamic 41 detector series is
exclusively available for following systems:••••

Phoenix V|tome|x M
Phoenix V|tome|x C
Phoenix V|tome|x L
Phoenix X|cube

200 µmROI 1

X-ray source

100 µmWithout the need to change the system geometry parameters, the new
Dynamic 41|100 detector allows imaging of larger objects at the same resolution
due to less required geometric magnification. Alternatively, users are able to detect
2x smaller defects without increasing the geometric magnification.

Detector characterization
parameter
The Dynamic 41|100 detector characterization according to ASTM E2597-14
for AL, TI and Inconel is displayed below (valid for specific detector gain settings):

Aluminum Al-6061

Titanum Ti-6Al4V

SRB (basic spatialresolution)
12Specific Material
Thickness Range

63Image Lag

9Specific Material
Thickness Range

63CS (contrastsensitivity)0

Efficiency =dSNRn@1mGy

SRB (basic spatialresolution)
1299Specific Material
Thickness Range

Inconel 718

SRB (basic spatialresolution)
12CS (contrastsensitivity)0

Efficiency =dSNRn@1mGy

Image Lag

63CS (contrastsensitivity)0

Efficiency =dSNRn@1mGy

Image Lag

The Dynamic 41|200p+ detector characterization according to ASTM E2597-14
for AL, TI and Inconel is displayed below (valid for specific detector gain settings):
Aluminum Al-6061
iSRb (basic spatialresolution)
12
Specific Material
Thickness Range108Specific Material
Thickness Range

6420

Efficiency =dSNRn@1mGy

CSa (contrastsensitivity)

Image Lag

Efficiency =dSNRn@1mGy

Titanum Ti-6Al4V

Inconel 718

iSRb (basic spatialresolution)
12iSRb (basic spatialresolution)
1210
8Specific Material
Thickness Range

6420

CSa (contrastsensitivity)

Image Lag

Efficiency =dSNRn@1mGy

1086420

CSa (contrastsensitivity)

Image Lag

General specifications
Pixel Size

Dynamic 41|100

Dynamic 41|200p+100 µm; 200 µm
with 2 x 2 binning

200 µm, 400 µm
with 2 x 2 binning

Active Area (approx.)

405 x 405 mm (16” x 16”)

Pixel Matrix

4096 x 4096 (16 MP),usable: 4048 x 4048

2048 x 2048 (4 MP),usable: 2024 x 2024

Max. Frame Rate

Full FOV: 3 fps;
20 x 20 cm ROI: 5 fps
10 x 10 cm ROI: 10 fps

Full FOV: 20 fps;
20 x 20 cm ROI: 30 fps

Dynamic Range

10 000 : 1

Lifetime Extension

Design optimized for industrial high energy
CT applications

Low Ghosting

To take images in quick succession

High Sensitivity

Shorter exposures with same brightness

ASTM E2597/DICONDE

CompliantPhoenix Dynamic 41|100 & 41|200p+- Your Advantages• Large area detector with superior image and result quality• The Dynamic 41 detector family is exclusively available
for Waygate Technologies system customers• Reduce inspection times due to increased detector sensitivity, faster frame rates,
larger imaging area and adaptive imaging modes• 100 µm resolution captured with the efficiency and CNR of a state of the art 200 µm detector• Premium CT results in less timeDynamic 41|100 and 41|200p+
Key features & benefits• 16” X-ray detectors with 100 µm / 200 µm pixelsize (16 or 4 MPixels)
designed and optimized for longterm reliability at industrial
high-energy use• High-resolution images for easy detection of subtle indications(up to 50 µm /100 µm feature detection with minifocus X-ray tubes)• Next generation photodiode design for up to 10x improved efficiency
and sensitivity compared to state of the art 200 µm pixel DXR detectors
allows 2x resolution increase without cycle time impact (41|100)
or 2-3x cycle time increase without image quality impact (41|200p+)• Detection of 2x smaller defects without increase of geometricmagnification allows imaging of large objects at higher resolution (41|100)

WaygateTechnologies

Niels-Bohr-Str. 731515 Wunstorf
Germany
Tel.: +49 5031 172 100
Fax: +49 5031 172 299
E-mail: phoenix-info@bakerhughes.com

Waygate Technologies USA, LP
11988 Tramway Dr
Cincinnati, OH 45241
USATel.: 1 844 991 0474

For more detailed information or to request a demo, please visit our website or contact us.

Copyright 2020 Baker Hughes Company. All rights reserved.
BHCS38519		

(09/2020)

waygate-tech.com