April 25, 2013 (Thu)
Opening remark (10:00)
Session 1 (10:05-12:55)
O1-1. (10:05-10:30)

Chair:Masashi Nojima, Hubert Gnaser- Invited -Atom probe tomography of Si nanocrystals embedded in silicon oxide
Hubert Gnaser (University of Kaiserslautern)O1-2. (10:30-10.55)- Invited -Dopant analysis of semiconductor devices with atom probe tomography
Yasuo Shimizu (Tohoku University)
O1-3. (10:55-11:20)- Invited -Reconstruction and quantification issues for APT in microelectronics
Sebastien Duguay (University of Rouen)
Break (11:20-11:35)
O1-4. (11:35-12:00)- Invited -Mechanism of laser assisted field evaporation from insulating oxides
Masaru Tsukada (Tohoku University)
O1-5. (12:00-12:25)- Invited -Progress in planar-feature spatial reconstruction for atom probe tomography
David J. Larson (CAMECA)
O1-6. (12:25-12:40)

Application of continuous Ar cluster ion beams to peptide analysis
Satoka Aoyagi (Shimane University)
O1-7. (12:40-12:55)

Soft-sputtering of insulin molecule using Ar, Kr and methane gas cluster ion beams
Kousuke Moritani (University of Hyogo)
Lunch (12:55-13:55)

Session 2 (13:55-16:30)
O1-8. (13:55-14:20)

Chair:Jiro Matsuo, Alex Shard- Invited -Plasma ion sources for high resolution primary ion beams
Noel Smith (Oregon Physics)
O1-9. (14:20-14:45)- Invited -Helium ion microscopy (HIM) technology for imaging and characterization for
nano-device materials and structures
Shinichi Ogawa (AIST)O1-10. (14:45-15:10)- Invited -Resonant enhanced multiphoton ionization and its application to Laser-SNMS
Masaaki Fujii (Tokyo Institute of Technology)
Break (15:10-15:25)
O1-11. (15:25-15:50)- Invited -Surface roughening of silicon by low-energy oxygen bombardment: Influence on SIMS
depth profiling
Yuji Kataoka (Fujitsu)
O1-12. (15:50-16:15)- Invited -In-situ combination of secondary ion mass spectrometry (SIMS) and scanning probe
microscopy (SPM) for high-sensitivity and high-resolution elemental 3D analysis
Tom Wirtz (Centre de Recherche Public - Gabriel Lippmann)
O1-13. (16:15-16:30)

Direct access to true 3D chemical information by combined in-situ TOF-SIMS and SFM
measurements
Derk Rading (ION-TOF)

Sponsored session 1 (16:30-17:10)
S1-1. (16:30-16:50)

Chair:

Akio Takano, Yeonhee Lee- Invited -Applications of dynamic SIMS in the areas of semiconductor, LED and photovoltaic
Larry Wang (Evans Analytical Group/Nano Science)S1-2. (16:50-17:10)

New CAMECA IMS 7f-Auto: high throughput & automation
Paula Peres (Cameca/Ametek)

Poster short presentation (17:10-17:30)

Chair:

Akio Takano, Yeonhee Lee

Poster session (17:30-18:30)
P-1. Atom probe analysis of electroconductive polymers
Masahiro Taniguchi (Kanazawa Institute of Technology)
P-2. Effect of emitter shape on vacuum electrospray
Satoshi Ninomiya (University of Yamanashi)
P-3. TOF-SIMS study using gas cluster ion beam for analysis of Li reaction products onelectrodes of lithium air batteries
Akiya Karen (NIMS)
P-4. Characterization of distribution of boron in martensitic steels by secondary ion mass

spectrometry
Shigeru Suzuki (Tohoku University)P-5. Relation between secondary ion species and mass accuracy in TOF-SIMS
Daisuke Kobayashi (Asahi Glass)P-6. Imaging of carbon incorporation during plant cell wall formation using NanoSIMS

50L
Miyuki Takeuchi (The University of Tokyo)
P-7. Study on the sputtering mechanism of amino acid with Ar cluster ion beamirradiation
Makiko Fujii (Kyoto University)P-8. Effects of cluster ion beam irradiation with a mixture of noble and reactive gases on

inorganic solids
Shunichiro Nakagawa (Kyoto University)
P-9. Surface morphology of sputtered SiC epitaxial layer
Junichiro Sameshima (Toray Research Center)

Social meeting (18:30-19:30)

April 26, 2013 (Fri)
Session 3 (9:00-11:25)
O2-1. (9:00-9:25)

Chair:

Atsushi Murase, Tom Wirtz- Invited -Standards for practical organic depth profilingAlex Shard (NPL)
O2-2. (9:25-9:50)- Invited -Electrode surface analyses for Li-ion and Na-ion batteries
Shinichi Komaba (Tokyo University of Science)O2-3. (9:50-10:15)- Invited -Surface analysis and depth profiling of polymers by TOF-SIMS
Yeonhee Lee (KIST)
O2-4. (10:15-10:30)

Development of MeV-SIMS imaging system with electrostatic quadrupole lens
Toshio Seki (Kyoto University)
O2-5. (10:30-10:45)

Evaluation of layered titanate nanosheets using TOF-SIMS and g-ogram
Ichiro Mihara (Kuraray)
Break (10:45-11:00)
O2-6. (11:00-11:25)- Invited -Taking on fresh strategies in mass spec (TOF-SIMS) imaging: multivariate,multitechnique, multidimensional
Dan Graham (University of Washington)

Sponsored session 2 (11:25-12:25)

Chair:

Atsushi Murase, Tom Wirtz

S2-1. (11:25-11:45)

Recent news from ION-TOF
Markus Terhorst and Derk Rading (ION-TOF/Hitachi High-Tech Solutions)S2-2. (11:45-12:05)

New application of functional hybrid FIB-TOF-SIMS
Takeharu Ishikawa (Toyama)S2-3. (12:05-12:25)

TOF-SIMS for biological and real-world samples analysis
Noriaki Sanada (Ulvac-Phi)
Lunch (12:25-13:25)

Session 4 (13:25-15:45)
O2-7. (13:25-13:50)

Chair:Satoka Aoyagi, Peter Williams- Invited -Ambient organic SIMS analysis by impacting sample surface with primary ion species
generated by both ESI and APCI
Jentaie Shiea (National Sun Yat-Sen University)
O2-8. (13:50-14:15)- Invited -Visualization of transdermal drug delivery by two-dimensional desorption electrosprayionization (2D-DESI) mass spectrometry; a novel approach to generate pseudocross-sectional penetration images
Akira Motoyama (Shiseido)
O2-9. (14:15-14:40)- Invited -Desorption/ionization induced by neutral cluster impact as a soft and efficient ionization
source for mass spectrometry of biomolecules
Michael Dürr (Esslingen University of Applied Sciences)O2-10. (14:40-15:05)- Invited -Platinum vapor deposition surface-assisted laser desorption/ionization for mass
spectrometry imaging of small molecules
Tomoyuki Ozawa (Nissan Chemical Industries)
O2-11. (15:05-15:30)- Invited -Applications of laser desorption/ionization spiral high-resolution time-of-flight mass
spectrometry in material science
Yoji Nakajima (Asahi Glass)O2-12. (15:30-15:45)

Chemical mapping of plant biomolecules by the cryo-TOF-SIMS/SEM system
Yuto Hanaya (Nagoya University)
Break (15:45-16:00)

Session 5 (16:00-18:10)
O2-13. (16:00-16:25)

Chair:

Akiya Karen, Dan Graham- Invited -Quantitative studies of oxygen effects in SIMSPeter Williams (Arizona State Univ.)
O2-14. (16:25-16:50)- Invited -Shave-off analysis of nano-scale objects
Masanori Owari (The University of Tokyo)

O2-15. (16:50-17:15)- Invited -Imaging mass spectroscopy analysis for micro cell samples: Understanding of a metabolic
activity of Subseafloor life
Motoo Ito (JAMSTEC)
O2-16. (17:15-17:40)- Invited -A new aspect of Laser-SNMS coupled with Ga FIB for polymer analysis
Tetsuo Sakamoto (Kogakuin University)
O2-17. (17:40-17:55)

Towards SIMS on the helium ion microscope
Tom Wirtz (Centre de Recherche Public - Gabriel Lippmann)
O2-18. (17:55-18:10)

Development of sputtered neutral mass spectrometer to analyze sub-micron noble gas
distribution
Ken-ichi Bajo (Hokkaido University)

Closing remark (18:10)