IGBT modules: T series NX type reliability test results
Table 1. Reliability test results
The results for representative module are shown in below table.
Test Category
試験項目
Temperature cycling
温度サイクル
Variable frequency vibration
振動
Terminal strength
端子強度(引張)
Tightening strength
締付トルク強度
Soldering thermostability
はんだ耐熱Solderability
はんだ付け性High temperature Storage
高温保存
Low temperature Storage
低温保存
Moisture resistance
耐湿性High temperature reverse bias
高温逆バイアスHigh temperature gate bias
高温ゲートバイアス
Intermittent operation life
断続通電

Test condition
試験条件-40 °C ~ 125 °C (air), 10 cycles
t=60 minutes at each temp.
10Hz - 500Hz / 15 min., 100m/s2=10G,
X, Y, Z : 2 hours in each direction.
19.6N (signal terminals),
10 seconds
Main terminals: 4.5N･m(M6)
Mounting to heat sink: 3.5N･m(M5)260°C,
10 seconds (signal terminals)
245°C (signal terminals),
5 seconds
Ta=125 °C
t=1000 hours
Ta=-40 °C
t=1000 hours
Ta=60 °C, 90 %RH
t=1000 hours
Tvj=150 °C, VCE(DC)=VCES(rating) x 0.85,
VGE=short, t=1000 hours
Tvj=150 °C,
VGE(DC)=+20V
VCE=short,
VGE(DC)=-20Vt=1000 hours
Tc=50～100 °C,
5,000 cycles

Number ofsamples
試料数

Number offailures
故障数50505050505050505050505050Table 2. Failure criteriaParameter
測定項目

Measurement conditions
測定条件

ICES

VCE=VCES(rating), G-E short-circuited

IGES
VGE(th)VCEsat
VEC
Visol

VGE=VGES(rating), C-E short-circuited
IC=IC(rating)/10000A, VCE=10V
IC=IC(rating)A, VGE=15V
IE=IE(rating)A, G-E short-circuited
Visol= Visol(rating), AC 1 minute between
shorted all terminals and base plate

Criteria for failure
故障判定基準Lower/下限

Upper/上限－U.S.L.×2.0－
L.S.L.×0.8－－

U.S.L.×2.0
U.S.L.×1.2
U.S.L.×1.2
U.S.L.×1.2

Break down

Additional notes:(1) The measurements are performed under our determined temperature and humidity environment.
(2) The symbols in the table are as follows.
U.S.L : Upper Specification Limit
L.S.L : Lower Specification Limit(3) The U.S.Ls and L.S.Ls are determined on the basis of Specification, which is designated as our standard modulespecification. In regards to those not defined in Specification, our own internal specifications are applied in lieu thereof.
(4) The measurement items of each test are selected according to our standards

Publication Date : Nov. 2023
1

IGBT modules: T series NX type reliability test results
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Publication Date : Nov. 20232