HVIGBT modules: X series reliability test results
Table 1. Reliability test results
The results for representative module are shown in below table.
Test Category
試験項目

Test condition
試験条件

Number ofsamples
試料数

Number offailures
故障数

Temperature cycling
温度サイクル-40°C ~ 125°C (air), 500 cycles,
t=60 minutes at each temp.

50Variable frequency vibration
振動10Hz - 500Hz / 15 min., 100m/s2=10G,
X, Y, Z : 2 hours in each direction.

50High temperature Storage
高温保存

Ta=150 °C,
t=1000 hours

50Low temperature Storage
低温保存

Ta=-55 °C,
t=1000 hours

50Moisture resistance
耐湿性

Ta=85°C, 85%RH,
t=1000 hours

50High temperature reverse bias
高温逆バイアス

Tvj=150°C, VCE(DC)=VCES(rating) x 0.85,

50High temperature gate bias
高温ゲートバイアス

Tvj=150 °C,

VGE(DC)=+20V

50VGE(DC)=-20V

50

50

VGE=short, t=1000 hours
VCE=short,t=1000 hours

Intermittent operation life
断続通電

Tc=68°C,40,000 cycles

Table 2. Failure criteria
Parameter
測定項目

Measurement conditions
測定条件

Criteria for failure
故障判定基準Lower/下限

Upper/上限

ICES

VCE=VCES(rating), G-E short-circuited－U.S.L.×2.0

IGES

VGE=VGES(rating), C-E short-circuited－

U.S.L.×2.0

VGE(th)

IC=IC(rating)/10000A, VCE=10V

I.V.D.×0.5
L.S.L.×0.8

I.V.D.×1.5
U.S.L.×1.2

VCEsat

IC=IC(rating)A, VGE=15V－

U.S.L.×1.2

VEC

IE=IE(rating)A, G-E short-circuited－U.S.L.×1.2

Visol

Visol= Visol(rating), AC 1 minute between
shorted all terminals and base plate

Break down

Additional notes:(1) The measurements are performed under our determined temperature and humidity environment.
(2) The symbols in the table are as follows.
U.S.L : Upper Specification Limit
L.S.L : Lower Specification Limit
I.V.D : Initial Value of the individual Device(3) The U.S.Ls and L.S.Ls are determined on the basis of Specification #300, which is designated as our standard module
specification. In regards to those not defined in Spec. #300, our own internal specifications are applied in lieu thereof.
(4) The measurement items of each test are selected according to our standards

Publication Date : Nov. 2023
1HVIGBT modules: X series reliability test results
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