Automotive IGBT modules : J1 series reliability test results
Table 1. Reliability test results
J1 series type name : CT600CJ1A060-A/CT700CJ1A060-A
The results of CT700CJ1A060-A are described below table.
Test Category
試験項目

Test condition
試験条件

Temperature cycling
温度サイクルVibration
振動
Terminal strength (pull)
端子強度(引張)
Tightening torque
締付トルク強度
High temperature storage
高温保存
Low temperature storage
低温保存High-temperature
high-humiditystorage
耐湿性High temperature reverse bias
高温逆バイアスHigh temperature gate bias
高温ゲートバイアス
High temperature high-humidity bias
高温高湿逆バイアスPower cycling
パワーサイクルElectrostatic discharge (HBM/ESD)
静電耐量-40°C ~ 125°C
t=30 minutes at each temp.
1,000 cycles
10Hz - 500Hz / 15 minutes
100m/s2=10G
X, Y, Z: 2 hours in each direction.
Weight 9.8N
10 seconds
Main terminals (M5): 6.0N・m
Module mounting (M5): 6.0N・m
10 seconds
Ta=150 °C
t=1,000 hours
Ta=-40 °C
t=1,000 hours
Ta=85 °C, 85 %RH
t=1,000 hours
Ta=150 °C, VCE=638V, VGE=short
t=1,000 hours
Ta=150 °C, VGE=+20V, VCE=short
t=1,000 hours
Ta=85 °C, 85 %RH, VCE=638V,
VGE=short
t=1,000 hours
ΔTj=100℃
30,000 cycles
C= 100pF, R= 1,500Ω
Applied voltage: ±2,000V

Number ofsamples
試料数

Number offailures
故障数505050505050505050505050

Table 2. Failure criteria
Criteria for failure
故障判定基準Lower Limit
Upper Limit
下限
上限

Parameter
測定項目

Measurement conditions
測定条件

ICES
IGES
VGE(th)VCEsat
VEC'VCE=VCES(rating)V, G-E short-circuited'VGE=VGES(rating)V, C-E short-circuited'IC= IC(rating)/10,000 A, VCE= 10V'IC= IC(rating)A, VGE= 15V'IE= IE(rating)A, VGE= 0V
Visol= 2,500Vrms; 60Hz, 1 minute between all terminals(short) and the baseplate

Visol－－
L.S.L.×0.8－－Remarks
備考

U.S.L.×2.0
U.S.L.×2.0
U.S.L.×1.2
U.S.L.×1.2
U.S.L.×1.2

Break down

Additional notes*1) The measurements are performed under the temperature and humidity environment we have determined.
*2) The abbreviations in this Table are as follows:
U.S.L: Upper Specification Limit
L.S.L: Lower Specification Limit*3) The U.S.Ls and L.S.Ls are determined based on the specification.
*4) The measured items (i.e., parameters) of each test are selected according to our standards.

Publication Date : Nov. 2023
1Automotive IGBT modules : J1 series reliability test results
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Publication Date : Nov. 20232