C on f e r e n c e P r o g r a m

XOPT
Monday, 19 April[XOPT-1-01]  9:30-9:40
Opening Remarks

XOPT-3-03  11:30
Optimization of mirror deformation
method for hybrid bender combining
mechanical and piezoelectric bending

Chair: Tetsuya Ishikawa
RIKEN SPring-8 Center

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Yuka Nishioka , Takato Inoue ,Satoshi Matsuyama‌2,‌ Junki Sonoyama‌3‌,
Kazuteru Akiyama‌3‌, Hiroki Nakamori‌4,‌
Yasuhisa Sano‌1,‌ Yoshiki Kohmura‌5‌,
Chair: Takashi Kimura
Makina Yabashi‌5,‌ Tetsuya Ishikawa‌5,‌
The University of TokyoKazuto Yamauchi‌1‌‌1‌‌Osaka University, ‌2Nagoya
University,
XOPT-2-01  9:40
Invited ‌3‌TOYAMA, ‌4‌JTEC Corporation, ‌5‌RIKEN/Spring-8
Advanced X-ray optics and metrology We will discuss the optimal deformation
development at NSLS-II
method for the hybrid bender combining
Mourad Idir, Lei Huang, Tianyi Wang
mechanical and piezoelectric bending andBNL/NSLS-II
the achievable accuracy of this method.
During this talk, we will present our recent
work on our newly established stitching
XOPT-3-04  11:45
interferometry platform, and our upgraded
Development of sub-5 nm focusing
Nano Surface Profiler (NSP) for synchrotron system based on precise deformablemirror metrology. Thanks to these newmirrors
metrology capabilities, we have developed
Takato Inoue‌1‌, Satoshi Matsuyama‌1,2‌,
our in house Ion Beam Figuring deterministic
Yuto Tanaka‌1‌, Kohei Futamura‌1,‌polishing system. Some new achieved
Yoshio Ichii‌3‌, Jumpei Yamada‌4‌, Yasuhisa Sano‌1‌,
results will be shown during the talk.
Yoshiki Kohmura‌4,‌ Makina Yabashi‌4,5‌,
Tetsuya Ishikawa‌4‌, Kazuto Yamauchi‌1‌‌
XOPT-2-02  10:10Invited ‌1‌Osaka University, ‌2Nagoya
University, ‌3‌JTEC‌
Development of sub-micron soft x-ray Corporation, ‌4‌RIKEN SPring-8 Center, ‌5Japan
free-electron laser focusing system at Synchrotron Radiation Research InstituteSACLA
To focus X-ray down to sub-5 nm, shape
Hiroto Motoyama
error on mirrors should be less than 0.6 nm
The University of Tokyo
PV. We installed a deformable mirror. In FEM
simulation, the mirror could correct a shape
Ellipsoidal mirrors are promising optics forfocusing soft x-rays down to sub-micromtre error produced by fabrication processes.
size without chromatic aberration. A soft
x-ray focusing system combining an[XOPT-4]  13:00-14:00
ellipsoidal mirror and a K-B mirror was
Wavefront / Imaging
developed at SACLA. The focused beam size Chair: Hiroto Motoyama
is 500 x 550 nm with a maximum peak
The University of Tokyo
intensity of ~1016 W/cm2 at the photon
energy of 100 eV. The microscopic properties XOPT-4-01  13:00
of materials having absorption edges in theSingle-grating interferometer for hard
soft x-ray region will be investigated with
X-ray sub-10nm focusing mirror
the system.

Program[XOPT-2]  9:40-10:40
Advances in X-ray mirrorsystem[XOPT-3]  11:00-12:00
X-ray optics
Chair: Taito Osaka
RIKEN SPring-8 Center

XOPT-3-01  11:00
Wave-optical simulation for soft X-rayfocusing optics using coherent mode
decomposition
Yoko Takeo‌1,2‌, Takashi Tanaka‌3‌,
Yasunori Senba‌2,3‌, Haruhiko Ohashi‌2,3‌,
Hidekazu Mimura‌1‌‌1‌
The University of Tokyo, ‌2‌Japan Synchrotron‌Radiation Research Institute (JASRI), ‌3RIKEN
SPring-8 Center (RSC)
Spatial and temporal coherence of the soft
X-ray focusing beam was estimated using
wave-optical calculation with coherent mode
decomposition. Quality of reconstructed
images in ptychography measurement wascompared between simulation andexperimental results.

XOPT-3-02  11:15
Processing a micro-channel-cut
crystal monochromator using Ni wire
for reflection self-seeded X-ray
free-electron laser
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Shotaro Matsumura , Shota Nakano ,Yasuhisa Sano‌1‌, Taito Osaka‌1,2‌, Ichiro Inoue‌2,‌
Makina Yabashi‌2‌, Kazuto Yamauchi‌1‌‌1‌Osaka University, ‌2‌RIKEN SPring-8 Center
A high-quality channel-cut crystal
monochromator with a gap width of ~100μm is indispensable for reflection selfseeded X-ray free-electron laser. We report
the details about instrument and results ofprocessing the crystal.

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Jumpei Yamada‌1‌, Satoshi Matsuyama‌2‌,
Nami Nakamura‌3‌, Takato Inoue‌3‌, Taito Osaka‌1‌,
Ichiro Inoue‌1‌, Hirokatsu Yumoto‌4‌,
Takashi Koyama‌4,‌ Haruhiko Ohashi‌4,‌
Kazuto Yamauchi‌3,‌ Makina Yabashi‌1‌‌1‌
RIKEN SPring-8 Center, ‌2‌Nagoya University,‌3‌
Osaka University, ‌4‌JASRI
X-ray single-grating interferometry wasapplied to conduct accurate wavefront
corrections for hard X-ray nanofocusing
mirrors. Systematic errors in theinterferometer were carefully examined, andthe mirror shapes were directly correctedusing a differential deposition techniquebased on the measured wavefront errors.

XOPT-4-02  13:15
Development of wavefront sensing infull-field X-ray microscopy
Yuto Tanaka‌1‌, Satoshi Matsuyama‌1,2‌,
Takato Inoue‌1‌, Nami Nakamura‌1‌,
Jumpei Yamada‌1,3‌, Yoshiki Kohmura‌3‌,
Makina Yabashi‌3‌, Kazuhiko Omote‌4,‌
Tetsuya Ishikawa‌3‌, Kazuto Yamauchi‌1‌‌1‌‌Osaka University, ‌2NagoyaUniversity, ‌3‌RIKEN
SPring-8 Center, ‌4‌Rigaku Corporation
We proposed an in-situ wavefront
measurement based on the intensity
information near the focus. Applying thismethod, we were able to measure wavefront
aberrations of the AKB mirrors in themagnifying geometry.

XOPT-4-03  13:30
InvitedNano-scale Chemical State
Visualization of Functional Materials
Using Ptychography-XAFS
Nozomu Ishiguro, Yukio Takahshi
Tohoku University
Ptychography- XAFS, a combination of
ptychography imaging using coherent X-rays
and XAFS spectroscopy, is one of the mostpromising tools for visualizing not only themesoscopic structures but also theirchemical states of the non-uniform materials
in nano-scale. Here, we reportdemonstrations of nano -scale chemical
state visualization of practical functional
materials using ptychography-XAFS
measurements.

[XOPT-6]  15:20-16:30
FEL-related topics
Chair: Ichiro Inoue
RIKEN SPring-8 Center

XOPT-6-01  15:20
InvitedMeasurement of transient opticalphase change as a potential
diagnostics tool for extreme-ultraviolet
free-electron-laser pump opticalprobe experiments

Victor Tkachenko‌1,2‌, Sven Toleikis‌3,‌Vladimir Lipp‌2‌, Beata Ziaja‌4,‌ Ulrich Teubner‌1‌‌1‌
University of Applied Sciences, Emden,Germany, ‌2‌Center for Free-Electron Laser
Science CFEL, DESY, Hamburg, Germany,‌3‌
Deutsches Elektronen-Synchrotron DESY,Hamburg, Germany, ‌4‌Institute of Nuclear[XOPT-5]  14:10-15:10
Physics, Polish Academy of Sciences, Krakow,
PolandApplication / Detectors
Transient optical properties are typical
Chair: Satoshi Matsuyama
observables in extreme-ultraviolet-pump
Nagoya University
optical-probe experiments. Here we propose
XOPT-5-01  14:10
Invited to additionally measure transient phasechange of the optical probe pulse. OurFeasibility study on 3D dynamic X-ray computational study demonstrates that, atelastography for soft tissue and soft
correctly tuned pulse parameters, suchmaterials
measurement can provide a strong enough
Chika Kamezawa‌1‌, Liang Xiaoyu‌2‌,
signal enabling access to more information
Tetsuro Shirasawa‌3,‌ Akio Yoneyama‌4,‌
on transient state of the target.
Kentaro Kajiwara‌5,‌ Kazuyuki Hyodo‌1‌,
Wataru Yashiro‌2‌
XOPT-6-02  15:40
Invited‌1‌
Photon Factory, Institute of Materials Structure
A diamond channel cut
Science/ KEK, ‌2‌Institute of Multidisciplinary
monochromator for operation at highResearch for Advanced Materials (IMRAM),
Tohoku University, ‌3‌National Metrology Institute energy and high repetition rate at theof Japan (NMIJ), National Institute of Advanced EuXFEL: a numerical modeling of thethermal load effects
Industrial Science and Technology (AIST),‌4‌
Kelin Tasca‌1‌, Ilia Petrov‌1,‌ Fang Yang‌1‌,
SAGA Light Source, ‌5‌Japan Synchrotron
Sergey Terentyev‌2‌, Maurizio Vannoni‌1,‌
Radiation Research Institute (JASRI)
Liubov Samoylova‌1‌
We are developing dynamic x-ray‌1‌‌European X-ray Free Electron Laser, ‌2Technolelastography for soft tissue and soft
Inst Superhard & Novel Carbon Matmaterials. We show preliminary results ofthree-dimensional maps of storage and loss A diamond channel cut monochromator for
operation at high energy and high repetition
moduli using white synchrotron x-rays andrate at the EuXFEL: a numerical modeling ofhigh speed x-ray camera.
the thermal load effects will be presented.

XOPT-5-02  14:30
Invited
XOPT-6-03  16:00
InvitedAdditive Manufacturing for X-ray
Hanbury Brown and Twiss
optical applications
Interferometry at X-ray Free-Electron
Adam Kubec‌1‌, Frank Seiboth‌2‌,LasersMikhail Lyubomirskiy‌2,‌ Frieder Koch‌1‌,Andreas Schropp‌2‌, Christian David‌1,‌
Christian Schroer‌2,3‌‌1‌‌‌3‌Paul Scherrer Institut, ‌2DESY,Universität
Hamburg
3D-printing allows making various kinds of
X-ray optical components. Structures can bemade to focus beams, correct for phase
existing optics or adding custom phase
modifications such as a topological charge,or act as samples.

Ivan Vartaniants
Deutsches Elektronen-Synchrotron DESY
The basic idea of the Hanbury Brown andTwiss (HBT) interferometry is to determine
the statistical properties of radiation fromthe normalized second-order intensity
correlation function obtained by measuring
the coincident response at two detector
positions. We implemented HBTinterferometry at different X-ray freeelectron laser (XFEL) sources from XUV toXOPT-5-03  14:50
Invited hard X-ray range. Recent results obtained atEuropean XFEL and PAL XFEL facilities will
CITIUS: a 17400 frames/s X-ray
be presented.

imaging detector with a linear
response over 600 Mcps/pixelTakaki Hatsui
RIKEN SPring-8 Center
Recent advances in photon sources deliverintense x-rays on to X-ray imaging
detectors; photon counting detectors arechallenged due to its limited count rate. TheCITIUS detector has been developed toovercome this limitation. Experimental
results will be reported with an emphasis on
its high dynamic range capability, where
CITIUS can detect over 600 Mcps/pixel.

[XOPT-7]  16:40-17:40
Novel optics/methods
Chair: Makina Yabashi
RIKEN SPring-8 Center

XOPT-7-01  16:40
InvitedThermoelastic stability of Braggreflectors under pulsed heat load in anXFELOImmo Bahns‌1‌, Wolfgang Hillert‌2‌,
Patrick Rauer‌1,‌ Joerg Rossbach‌2‌, Harald Sinn‌1‌‌1‌
European XFEL, ‌2‌Universität Hamburg
Thermoelastic stability of Bragg reflectors
under pulsed heat load in an XFELO will bepresented.

OPIC 2021・19-22 April, 2021

C on f e r e n c e P r o g r a m

XOPT
Monday, 19 April

Juergen Gluch‌1‌, Peter Gawlitza‌2,‌ Sven Niese‌3‌,
Reiner Dietsch‌3‌, Norman Huber‌4‌,
Ehrenfried Zschech‌1‌‌1‌Frauhofer IKTS, ‌2‌Fraunhofer IWS, ‌3‌AXO
DRESDEN GmbH, ‌4‌Huber DiffraktionstechnikGmbH & Co. KGA laboratory nano X-ray computed
tomography (nano-XCT) system that isdesigned for the photon energy range > 10keV and that uses multilayer optics forsample illumination and as objective lens
will be presented. A multilayer Laue lens(MLL) is used for full-field imaging. We will
demonstrate images of test structuresacquired with MLLs at photon energies of 8keV (Cu-Ka) and 17.5 keV (Mo-Ka).

Program

XOPT-7-02  17:00
InvitedLaboratory based hard X-ray
microscopy with Multilayer-Laue-Lensfor full-field imaging

XOPT-7-03  17:20
InvitedMulti-Focus Off-Axis Zone Plates forExperiments at X-Ray Free ElectronLasers
Florian Doering‌1,2‌, Benedikt Roesner‌1‌,
Martin Beye‌3‌, Robin Engel‌3‌, Loic Le Guyader‌4,‌
Andreas Scherz‌4‌, Manuel Langer‌1‌,
Adam Kubec‌1‌, Armin Kleibert‌1,‌ Joerg Raabe‌1‌,Carlos Vaz‌1‌, Christian David‌1‌
‌1‌
‌
‌3‌
Paul Scherrer Institut, ‌2XRnanotech,FLASH/‌XFELDESY, ‌4European
We have designed a new type of X-ray optic
that combines the beam-splitting
functionality of a transmission grating withthe focusing capabilities of a zone plate andhence, enables multi-focus experiments atXFELs.

[XOPT-Closing]  17:40-17:50
Closing Remarks
Chair: Kazuto Yamauchi
Osaka University

OPIC 2021・19-22 April, 2021

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