UC-8100 SeriesComponent Compatibility Guide
A list of peripheral components suitable for use with the UC-8100 series of computers
2016/12/08 Version 2.1© 2016 Moxa Inc. All rights reserved.

Copyright Notice©2016 Moxa Inc.
All rights reserved.

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Information in this document is subject to change without notice and does not represent a commitment on the part ofMoxa.
Moxa provides this document as is, without warranty of any kind, either expressed or implied, including, but not limited to,its particular purpose. Moxa reserves the right to make improvements and/or changes to this manual, or to the products
and/or the programs described in this manual, at any time.
Information provided in this manual is intended to be accurate and reliable. However, Moxa assumes no responsibility for
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This document might contain unintentional technical or typographical errors. Changes are periodically made to theinformation herein to correct such errors, and these changes are incorporated into new editions of the publication.

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1. Introduction
This document lists hardware components that are proven to provide the performance listed in thespecification when used with the Moxa UC-8100 series of embedded computers, or computers thatshare basic design features with the UC-8100 series. Moxa computers come with multiple
peripheral options and are engineered to work with components having different hardware
specifications. This flexibility could sometimes lead to compatibility issues. When used with theUC-8100 series of embedded computers, peripherals from one manufacturer may not work as wellas the ones made by another manufacturer. Moxa provides this list of UC-8100 series-compatible
components, so that users can be certain of a reliable performance from the UC-8100 series, when
it is used with the components listed in this document.

2. Testing Methods
To validate that a component meets the Moxa standards for quality and performance, the following
five key compatibility tests are run:
••
•
•
•

Ambient temperature burn-in
Low temperature hard start
Heat/humidity burn-in
Cyclic high-low temperature burn-in
Vibration test

Ambient Temperature Burn-In

The component is mounted on to an UC-8100 computer and put through a series of stress tests at
an ambient temperature of around 25˚C, for a specified period of time. The duration of the test isdetermined based on the class of peripherals being tested.

Low Temperature Hard Start

The component is mounted on to an unpowered UC-8100 computer and then the system is bootedup at an extremely low temperature. The designated low temperature value depends on thecomputer model being tested.

Heat/Humidity Burn-In

The component is mounted on to an UC-8100 computer, placed in a temperature- andhumidity-controlled enclosure, and then put through the burn-in test for a specified period of time.
The temperature, humidity, and time targets vary depending on the specification of the computermodel used in the test.

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Cyclic High-Low Temperature Burn-In

The component is mounted on to an UC-8100 computer, placed in a temperature controlled
enclosure, and then put through the burn-in test wherein the temperature is cyclically varied fromvery high to very low and back again, over a specified period of time. The target temperature range
and the duration of the test can vary depending on the specification of the computer model used in
the test.

Vibration Test

The component is mounted on to an UC-8100 computer that is bound inside an electromagnetic
vibrator, and then put through random vibration tests along three orthogonal axes: longitudinal,transverse, and vertical. The vibration tests are compliant with the EN50155/IEC61373 vibration
standards.

3. Storage Endurance
Storage media, such as SSDs, CF cards, SD cards, Disk on Module, and CFast, are composed ofdifferent electrical components. The main electrical components in these storage media, theNAND-flash memory and NAND-flash controller, impact the storage endurance and lifespan of thestorage media.

NAND-Flash Memory Endurance

NAND-flash memories have a limit on the number of times they can be programmed and erased(P/E). The P/E cycle as well as the erase count of a NAND-flash memory can be used to determine
this limit. For example, an SLC (single-level cell) flash memory has a 60,000 P/E cycle, an MLC(multi-level cell) flash memory has a 3,000 P/E cycle, and TLC NAND flash memories have P/E
cycle values up to 1,000. Each flash memory type has a different endurance level, which is why thestorage lifespan is based on the flash memory type. Storage that uses SLC type flash memory
could have the best endurance level compared with the MLC type storage. SLC storage usuallycomes with a 5-year OEM warranty (the actual warranty period depends on the original
manufacturer). MLC storage only comes with a 1- to 3-year warranty. The major differences
between SLC and MLC are: (a) The SLC NAND flash has a lifespan that is around 20 times that ofan MLC, and (b) The price can differ by a factor of 4 to 5. The SLC type of storage is recommended
for systems that are expected to have high reliability, and for applications that need to frequently
write data to a storage medium.

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Terabytes Written (TBW)

TBW is the unit used to evaluate SSD endurance. In actual applications, storage is used for routine
operations and data access. Therefore the physical P/E cycle is not appropriate for describing thetotal rewritable data capacity. The management efficiency of the storage controller also affects thetotal rewritable data capacity result. For these reasons, Joint Electron Device Engineering Council(JEDEC) has defined a standard for SSD endurance evaluation called JESD218, which uses TBW
to measure the endurance of the storage memory. By referring to this TBW value, users can easily
estimate the storage specification and select a suitable storage for real-life use cases. For example,
when routine operations need a maximum of 20 GB and the expected storage lifespan is 3 years,
the total rewritable data demand would be 21.9 TBW (20 GB x 365 x 3). In this case, a storage thathas more than 21.9 TBW will meet the requirement. We recommend selecting a storage media
with a TBW that is greater than the calculated value.

4. Declaration for Liability Exclusion
The specifications, warranty terms, and liability of items listed in this guide are the sole
responsibility of the original manufacturers. Moxa does not take any responsibility in this regard.
Please visit the manufacturers’ official websites for up-to-date product information before
purchasing the components.

5. Compatible Components
Peripheral components that have been tested and found suitable for use with the UC-8100 seriesof computers are listed in this section. The following table lists the Test Codes and theirdescriptions:
Test CodeDescriptionA

The component has passed the ambient temperature verification test

B

The component has passed the low temperature verification test

CThe component has passed the heat/humidity verification test

DThe component has passed the cyclic high-low temperature verification testEF

The component has not been tested, but is similar to another component thathas been tested in terms of its material and design.
The component has passed the vibration verification test

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VendorStorageSize

Moxa’s PN

Vendor’s PN

FlashMemory
Brand

ADATA

1 GB

N/A

ASDH32GUILC10-R

Apacer

1 GB

1352000012020

Apacer

4 GB

ApacerSD

Flash
MemorySpec

Controller

FirmwareWarranty

Warranty
Exclusion

Test
Codes

N/A

N/A

N/A

N/A

lifetime

N/AA

AP-ISD01GIS2B-3TN/A

SLC

N/A

N/A

3 years

Endurance > 60,000

B, C, D

N/A

AP-ISD04GCS4A-2CM

MicronMLC

PhisonN/A

2 years

Endurance > 3,000

E

8 GB

N/A

AP8GSDHC10U1Toshiba

MLC

PhisonN/A

2 years

Endurance > 3,000

E

Apacer

8 GB

N/A

AP-ISD08GCS4A-2CM

MicronMLC

PhisonN/A

2 years

Endurance > 3,000

E

Apacer

16 GB

N/A

AP16GSDHC10U1

Toshiba

MLC

PhisonN/A

2 years

Endurance > 3,000

E

Apacer

16 GB

N/A

AP16GSDHC10U2Toshiba

MLC

PhisonN/A

2 years

Endurance > 3,000

E

Apacer

16 GBN/A

AP-ISD16GCS4A-2CM

MicronMLC

PhisonN/A

2 years

Endurance > 3,000

E

Apacer

32 GB

N/A

AP32GSDHC10U1-R

Toshiba

MLC

PhisonN/A

2 years

Endurance > 3,000

A

Apacer

32 GB

N/A

AP32GSDHC10U2-R

Toshiba

MLC

PhisonN/A

2 years

Endurance > 3,000

A

Apacer32 GB

N/A

AP-ISD32GCD4A-2CM

MicronMLC

PhisonN/A

2 years

Endurance > 3,000

A

InnoDisk

1 GB

1352000012010

DS2A-01GI81W1B

Toshiba

SLC

N/A

N/A

5 years

Endurance > 60,000

B, C, D

InnoDisk

4 GB

1352000042013

DESDC-04GY81RW2SCToshiba

MLC

N/A

N/A

2 years

Endurance > 3,000

B, C, D

Memoright

2 GB

N/A

MRSDE1A002GB0S1I00

Samsung

SLC

N/A

N/A

5 years

N/A

B, C, D

Silicon Power

1 GB

N/A

SP001GBSDI000W201T

Toshiba

SLC

ITE

N/A

3 years

N/A

A

Transcend

32 GB

N/A

TS32GSDHC10U1

N/A

MLC

N/A

N/A

2 years

N/A

A

Transcend

32 GB

N/A

TS32GSDU1

N/A

MLC

N/A

N/A

2 years

N/A

A

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Micro SD

VendorStorageSize

Moxa’s PN

Vendor’s PNFlashMemory
Brand

Apacer2 GB

1352000022012

AP-MSD02GIDI-T

N/A

SLC

N/A

N/A

3 years

Endurance > 60,000

B, C, D

Apacer

8 GB

N/A

AP8GMCSH10U1-R

Toshiba

MLC

PhisonN/A

2 years

Endurance > 3,000

E

Apacer

16 GB

N/A

AP-MSD16GCH4P-1TM

Toshiba

MLC

PhisonN/A

2 years

Endurance > 3,000

E

Apacer

16 GB

N/A

AP16GMCSH10U1-R

Toshiba

MLC

PhisonN/A

2 years

Endurance > 3,000

E

Apacer

32 GB

N/A

AP-MSD32GCH4P-1TM

Toshiba

MLC

PhisonN/A

2 years

Endurance > 3,000

A

Apacer32 GBN/A

AP32GMCSH10U1-R

Toshiba

MLC

PhisonN/A

2 years

Endurance > 3,000

A

InnoDisk

2 GB

1352000022011

DS2M-02GI81AW1ST

Micron

SLC

N/A

N/A

5 years

Endurance > 60,000

B, C, D

InnoDisk

4 GB

1352000042010

D2SM-04GI81AW1ST

Micron

SLC

N/A

N/A

5 years

Endurance > 60,000

B, C

InnoDisk

8 GB

1352000082010

D2SM-08GI81AW1ST

Micron

SLC

N/A

N/A

5 years

Endurance > 60,000

B, C

Silicon Power

4 GB

N/A

SP004GBSTH010V10

N/A

SLC

N/A

N/A

3 years

N/A

E

Silicon Power

8 GB

N/A

SP008GBSTH010V10

N/A

SLC

N/A

N/A

3 years

N/A

A

Transcend

8 GB

N/A

TS8GUSDCU1

N/A

MLC

N/A

N/A

2 years

N/A

E

Transcend

16 GB

N/A

TS16GUSDCU1

N/A

MLC

N/A

N/A

2 years

N/A

E

Transcend

32 GB

N/A

TS32GUSDCU1

N/A

MLC

N/A

N/A

2 years

N/A

A

UC-8100 Series CCG V 2.1

FlashMemorySpec

Controller

FirmwareWarranty

Warranty
Exclusion

Test
Codes

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