設 備 ・機 器
Guide to Joint Use of Reuse Instruments at Osaka University

科学機器リノベーション・工作支援センターでは、科学機器リノベーション・工作支援センターは、本学所有の設備・機器の修理・バージョンアップ
本学所有の設備・機器の修理・バージョンアップを行い、を行い、学内での共同利用を推進しています。
学内での共同利用を推進しています。
大阪大学の学生・教職員の方に利用いただけ
大阪大学の学生・教職員の方に利用いただける
る分析機器・工作機械等についてご案内します。
分析機器・工作機器等についてご案内します。

大阪大学 科学機器リノベーション・工作支援センター
Center for Scientific Instrument Renovation and Manufacturing Support, Osaka University

大阪大学 科学機器リノベーション ・工作支援センター
2015.7月

Center for Scientific Instrument Renovation and Manufacturing Support,
Osaka University

■ Guide to Joint Use of Reuse Instruments at Osaka University
Based on the Master Plan for Instrument Maintenance at Osaka University, the Center for Scientific Instrument
Renovation and Manufacturing Support carries out repairs and version upgrades on university research and education
instruments with high general-applicability and utility. The repaired and upgraded instruments (reuse instruments) are
operated as jointly used instruments by students and academic staff at Osaka University, and the center acts as a liaison
handling applications for use.

■ Procedure for Joint Use of a Reuse Instrument➊ Application for use

Please apply from the "Reuse Instrument List/Reservations" page on thecenter's website:

https://www.reno.osaka-u.ac.jp/reuse-cam
Please apply for use by 15:00 on the working day prior to the desired day ofuse (Friday if the desired day is Monday). (There are instrument types forwhich applications must be made further in advance, so please provide someleeway ahead of time.)
There are limitations on the use period depending on the funding source forpayment.
Management expenses grants, scholarship donations:
Can be used throughout the year
Grants-in-Aid for Scientific Research (KAKENHI):
Up to December of each fiscal year
Commissioned research or joint research funding, etc.:
Up to February of each fiscal year

➋ Application approval,
finalization of reservation

If there are no problems with the application content (use schedule, request
for analysis, etc.), the applicant will be notified with an e-mail indicatingthat the reservation has been accepted.
Please understand that applicants may be asked to adjust their use scheduleat the discretion of the person in charge of instrument management.
If you will be using an instrument for the first time, or need technicalguidance, we will inquire about the experiment content and otherinformation, and coordinate with the center regarding the schedule, etc.

❸ Instrument use,
determination of fee

Please use the instrument according to the finalized schedule. To cancel orchange reservations, please contact us using the details indicated below.
On the day following instrument use, we will send confirmation of the usetime via e-mail.

➍ Payment of usage fee

In accordance with the finalized use time and fees, we will send a "Reuse
Instrument Use Report" to the user and respective party responsible forpaying usage fees; please confirm this on receipt.
Payment deadlines and other information on usage fees are as follows:■ Management expenses grants
The department in charge of payment will be notified of the paymenttransfer procedure in October for use in January through September, andin February of the following year for use in October through December.
■ Expenses other than management expenses grants:
The center will send a bill to the department in charge of payment.
(Fees will be aggregated for each quarter, and a bill sent in the following
month.)For details, please see the website:

https://www.reno.osaka-u.ac.jp/gakunai/gaibu_shiharai.pdf
For inquiries regarding applications for use, fee payment, instruments for use, or analysis by staff,

please contact the center as below.

Center for Scientific Instrument Renovation and Manufacturing Support (Suita District)

Tel.: 06-6879-4781 (Ext.: Suita 4781) E-mail: info@reno.osaka-u.ac.jp

■ List of Reuse Instruments by Instrument━━━━━━━━━━━━━
Elemental Analysis
ICP (Inductively Coupled Plasma) Emission Spectrometer Shimadzu ICPS-8100
Inductively Coupled Plasma-Optical Emission Spectrometer

Agilent Technologies

Electron Probe Microanalyzer (EPMA)JEOL JXA-8800R

ISIR・ No.22 1
Agilent 720 ICP

Pharm・ No.114 2
ISIR・ No.6

3

Wavelength Dispersive X-ray Fluorescence (WDXRF) Spectrometer Rigaku Supermini

OUIC・ No.93 3

Organic Trace Element Analyzer (CHN Analyzer)

Sci・ No.102 4

Yanaco CHN Corder MT-5

Mass Spectrometry
MALDI-TOF/TOF Mass Spectrometer （Bruker Ultraflex TOF/TOF）

Bruker Ultraflex TOF/TOF

Sci・ No.3

5

MALDI-TOF Mass Spectrometer（Applied Biosystems Voyagr DERP） Applied Biosystems Voyagr DERP

Sci・ No.46 5

MALDI-TOF Mass Spectrometer

Sci・ No.101 6

Shimadzu KRATOS AXIMA-CFR

ESI-Q-TOF Mass Spectrometer（Waters Q-TofUltimaAPI） Waters Q-TofUltimaAPI

Pharm・ No.49 6

ESI-Q-TOF Mass Spectrometer（Waters Q-Tof UltimaAPI） Waters Q-Tof Ultima API

Eng・ No.68 7

ESI-Qq-TOF Mass Spectrometer（Bruker micrO-TOFQII ） Bruker micrO-TOFQ II

ESI-IT Mass Spectrometer

BrukerSci・ No.35 7

Esquire3000plus

Pharm・ No.121 8

ESI-FT-ICR Mass Spectrometer（Bruker micrO-TOFQⅡ） Bruker Daltonics APEX IV-hR

ESI (or DART)-LIT-Orbitrap Mass Spectrometer

Thermo Fisher ScientificHigh Resolution Double Focusing Magnetic Sector Mass Spectrometer with Fast Atom Bombardment (FAB) Ion Source (Low-MS)

JEOL JMS-700

Sci・ No.36 8
LTQ-Orbitrap XL

Sci・ No.118 9
Pharm・ No.15 9

Direct Analysis in Real Time (DART) Mass Spectrometer JEOL Accu TOF-DARTISIR・ No.53 10

NMR
400 MHz Liquid-state NMR Spectrometer(JEOL ECS-400) JEOL ECS-400

Eng・ No.30 11

400 MHz Liquid-state NMR Spectrometer(JEOL ECS-400) JEOL ECS-400

Eng・ No.70 12

400 MHz NMR-Liquid(Bruker Biospin AV-400M)

Bruker Biospin AV-400M

IPR・ No.77 13

400 MHzJEOL RESONANCE ECS400

Sci・ No.120 13

JEOL RESONANCE ECA400WB

Sci・ No.90 14

Solid-state NMR Spectrometer(JEOL RESONANCE ECS400)

400 MHz Liquid-state and Solid-state NMR Spectrometer(JEOL Resonance ECA400WB)

500 MHz Liquid-state NMR Spectrometer(JEOL ECA-500) JEOL ECA-500
500 MHz NMR-Liquid(Agilent Technologies Unity-Inova 500)

Sci・ No.67 15

Agilent Technologies Unity-Inova 500

Eng. Sci.・ No.84 15

600 MHz Liquid-state NMR Spectrometer(JEOL ECA-600) JEOL ECA-600

ISIR・ No.97 16

600 MHz

Bruker BioSpin AVANCE III 600

Eng・ No.106 16

Agilent Technologies VNS600

Sci・ No.75 17

Liquid-state NMR Spectrometer

600 MHz Liquid-state and Solid-state NMR Spectrometer(Agilent Technologies

VNS600)700 MHz Liquid-state NMR Spectrometer(Bruker Biospin AVANCE 700)

Bruker Biospin AVANCE 700

200-MHz Solid-state NMR Spectrometer(Bruker BioSpin DSX-200)

Bruker BioSpin DSX-200

300 MHz Solid-state NMR Spectrometer（Chemagnetics Infinity 300）

JEOL CMX-300（Chemagnetics Infinity 300）

400 MHz Solid-state NMR Spectrometer(Bruker Biospin AVANCE400WB)

Bruker Biospin AVANCE400WB

600 MHz Solid-state NMR Spectrometer(Bruker BioSpin AVANCE III 600WB) Bruker

Electron

BioSpin AVANCE III 600WB

Sci・ No.76 18
Museum・ No.13 18

Sci・ No.4 19
Sci・ No.119 20
ISIR・ No.20 21

Spin ResonanceElectron Spin Resonance (ESR) Spectrometer(JEOL JES-FA200)

JEOL RESONANCE JES-FA200

Sci・ No.89 22

Electron Spin Resonance (ESR) Spectrometer(JEOL Resonance JES-TE200)

JEOL RESONANCE JES-TE200

Pharm・ No.79 22

X-band Electron Spin Resonance Spectrometer

JEOL

Electron Spin Resonance (ESR) Spectrometer(Bruker Biospin ELEXSYS E500)

Bruker Biospin ELEXSYS E500

RESONANCEJES X320

Sci・ No.123 23
IPR・ No.63 23

Magnetic Resoanace Imaging Apparatus
Magnetic Resonance Imaging (MRI) System for Small Animals

Bruker Biospin Avance II 500WB・ No.85 24

X-ray Diffraction
X-ray Diffractometer for Structural Analysis of Ultramicrocrystals

Rigaku RAPID

191R/FR-E

Sci・ No.8 24

Single-crystal X-ray Diffractometer Equipped with Charge-Coupled-Device (CCD) Detector

Rigaku AFC7R & MERCURY 2

ISIR・ No.21 25

■ List of Reuse Instruments by Instrument━━━━━━━━━━━━━
X-ray Diffraction
High Intensity Single-crystal X-ray Diffractometer with Flat /Curve IP Detector

Rigaku FR-E & R-AXIS IV++

ISIR・ No.74 25

Single-crystal X-ray Diffractometer

RigakuVariMax RAPIDⅡSci・ No.107 26

Micro Area X-Ray Diffractometer

RigakuRINT-RAPIDⅡ

Powder X-ray Diffractometer

Rigaku RINT2000

Multi-purpose X-ray Diffractometer(PANalytical

X'pert PRO MPD)

Sci・ No.124 26
Dentistry・ No.28 27

PANalytical X'pert PRO MPD

Multi-purpose X-ray Diffractometer(Rigaku SmartLab) Rigaku SMART LAB
X-ray Diffractometer for Structural Analysis of Single Crystals under Low- Temperature and High-Pressure

Eng・ No.44 27
ISIR・ No.71 28

Rigaku order-made system

Eng. Sci.・ No.31 29

Electron Microscope
Scanning Electron Microscope (SEM)(JEOL JSM-5310LV) JEOL JSM-5310LV

Eng. Sci.・ No.51 29

Scanning Electron Microscope (SEM)(Hitachi High-Technologies S-2150)

Hitachi High-Technologies S-2150

ISIR・ No.78 30

Field Emission Scanning Electron Microscope (FE-SEM)(Hitachi High-Technologies SU6600)

Hitachi High-Technologies Analytical Variable Pressure FE-SEM SU6600

Sci・ No.58 30

Field Emission Scanning Electron Microscope (FESEM)(Hitachi High-Technologies S-4200)

Hitachi High-Technologies S-4200

Eng・ No.43 31

Energy-dispersive X-ray Spectrometer

HORIBA EMXA-5770

Eng・ No.42 31

Field Emission Scanning Electron Microscope (FESEM) with Energy-dispersive X-ray Spectrometer (EDS)(JEOL LSM-6335, JED-2300F)

JEOL JSM-6335, JED-2300F

ISIR・ No.64 32

Field Emission Scanning Electron Microscope (FE-SEM) with Energy-dispersive X-ray Spectrometer (EDS)(JEOL JSM-7600F)

JEOL JSM-7600F

Sci・ No.98 33

Transmission Electron Microscope (TEM)(Hitachi High-Tech. H-7650)

Hitachi High-Technologies H-7650

Sci・ No.59 33

Transmission Electron Microscope (TEM)(JEOL JEM-2100) JEOL JEM-2100

Sci・ No.99 34

Electron microscopy sample preparation
wide diameter soft plasma etching device

Meiwa forsis co., LTD

SEDE-P

Sci・ No.98 34

Dual Beam Machining and Observation Apparatus

U.S.A.FEI XL830

High Vacuum Coating System

Leica EM-MED 020

Sci・ No.60 35

High Pressure Freezing System

Leica EM-HPM100

Sci・ No.55 36

Freeze Substitution System

Leica EM-AFS2

Sci・ No.54 36

X-ray Photoelectron Spectrometer (XPS)

Shimadzu KRATOS AXIS-165x

OUIC・ No.94 37

Secondary Ion Mass Spectrometry（SIMS）

ATOMIKA

ISIR・ No.122 37

Eng. Sci.・ No.108 35

Surface Analysis
SIMS410Morphological Observation
Atomic Force Microscope (AFM)

Keyence VN-8000, VN-8010
shimazu SPM-9500J3

OUIC・ No.96 38
Dentistry・ No.125 38

Spectroscopic Analysis Apparatus
Micro-stopped-flow Fluorescence Spectrophotometer

Applied Photophysics SX17MV

Sci・ No.33 39

Stopped-flow Rapid-scan Spectroscopy System

Unisoku RSP1000D

Eng・ No.11 39

Circular Dichrometer(Jasco J-805)

Jasco J-805

Circular Dichrometer(Jasco J-720W)

Jasco J-720W

Circular Dichrometer(Jasco/Oxford Instruments J-720W/MS4000) Jasco/Oxford Instruments J-720W/MS4000

Laser Raman Spectrometer(Jasco NR-1800)

Jasco NR-1800

Eng. Sci.・ No.40 40

Sci・ No.32 40
Sci・ No.81 41
Pharm・ No.72 42

Laser Raman Spectrometer Jasco( NR-1800)

Jasco NR-1800

Sci・ No.82 42

Fourier Transform Infrared (FT-IR) Spectrometer(Jasco FT/IR-6100)

Jasco FT/IR-6100

Sci・ No.83 43

FTIR Spectrometer Attached to IR Microscope

Thermo Fisher Scientific (former VG) Magna750, Nic-plan(INFRARED MICROSCOPE)

Eng・ No.45 44

Absolute Photoluminescence Quantum Yield Spectrometer Hamamatsu Photonics Quantaurus-QY(C11347-01)

OUIC・ No.92 44

UV-Vis-NIR Spectrophotometer

HITACHI

Eng・ No.116 45

Spectrofluorometer

HORIBA

FluoroMax-4

Sci・ No.117 46

High-sensitivity Isothermal Titration Microcalorimeter

MicroCal VP-iTC/1000

Sci・ No.16 46

Ultrahigh-sensitivity Isothermal Titration Microcalorimeter

MicroCal iTC200

Sci・ No.66 47

Thermal Analyzers

■ List of Reuse Instruments by Instrument━━━━━━━━━━━━━
Thermal Analyzers
Nano-Differential Scanning Calorimeter (Nano-DSC) CSC Nano-DSC

Sci・ No.17 47

Thermal Analysis System (TG-DTA、DSC、TMA)

Rigaku Thermo Plus EVO ⅡOUIC・ No.95 48

Zeiss Axio Observer, D1 equivalent

IFReC・ No.80 49

Bio-related analytical instrument
Fluorescence Microscope

Real-time Fluorescence Lifetime Imaging System Hamamatsu Photonics Nikon Aqua Cosmos RATIO Basic System

Pharm・ No.37 49

XL-I Analytical Ultracentrifuge

Beckman Coulter Optima XL-1

IPR・ No.2 50

XL-A Analytical Ultracentrifuge

Beckman Coulter Optima XL-A

IPR・ No.10 50

BECKMAN COULTER Optima L-90K

Pharm・ No.126 50

Fully Automated Nucleic Acid Extraction System KURABO NA-1000

Pharm・ No.47 51

Genetic Analyzer for DNA Sequencing and Fragment Analysis (LongCapillary_No.1)

Applied Biosystems ABI PRISM 310Genetic Analyzer

Med・ No.1 51

Surface Plasmon Resonance(SPR)GE Healthcare

Sci・ No.105 52

MicroArray Analysis Platform

Affymetrix

Flow Cytometer

BD

Biacore 3000

Sci・ No.111 53

FACS Calibur

Pharm・ No.115 54

Liquid Chromatography
Fast Protein Liquid Chromatography (FPLC) System

GE Healthcare AKTA explorer 10Sfrac-950

Sci・ No.34 54

Laser equipment
OPO Pulse Laｓeｒ System

U.S.A. ContinuumHigh Power Glass Laser System

Continuum custom system

Eng・ No.61 55

Laser Plasma EUV Light Source Apparatus

Coherent Custom Nd:YAG

ILE・ No.25 56

Powerlite9010+

Sunlite-EX

+

FX-1

Eng・ No.109 55

Work Apparatus
High Resolution 3D PrinterStratasys

Objet Eden 260

3D Shaping Systems (3D Scanner/3D Printer)

Solutionix Stratasys Rexcan ⅢDimension BST 3D Printer/Catalyst Vere.4.2

NC Fine Machine

PMT Micro MC-3

OUIC・ No.91 58

DELL

IFReC・ No.112 59

Dentistry・ No.88 56

Eng・ No.65 57

Computer
CLUSTER COMPUTER SYSTEM

HPC-ProServer

Other
Adiabatic Demagnetization Refrigerator System Cambridge Magnetic Refrigeration MF-ADR50/3T
Charged Particle Measuring Device

Sumitomo Heavy Industries

Eng. Sci.・ No.27 60

RCNP・ No.24 60

1. Elemental Analysis ①
ICP (Inductively Coupled Plasma) Emission Spectrometer
Shimadzu ICPS-8100(No. 22)■ Specifications/Features
The ICP-AES is a system enabling quantitative detection of elements containedin solution in extremely small amounts on the ppm order. It is used forcomposition analysis of single-crystal and thin-film samples, analysis of
impurity elements in various types of samples, and detection of trace elements
present in the environment.

This top-grade ICP emission spectrometer is equipped with two sequential
spectrometers, and it simultaneously achieves both high resolution (0.0045 nm)
and high-speed measurement.
Measurable elements: hydrogen, carbon, nitrogen, oxygen, halogens, andalmost all elements except noble gases■ Fee
Analysis by user

4,000 yen/hour

Analysis by staff

4,000 yen/hour + rate for operation 4,000 yen/hour
Contact us about the fee for sample preparation.

However, Institute of Scientific and Industrial Research’s
Incubation Building and Techno Alliance Building, and otheron-campus company-affiliated persons: 10,000 yen/hour■ Instrument location

Institute of Scientific and Industrial Research,
Comprehensive Analysis Center, Room 301

1｜Guide to Joint Use of Reuse Instruments

1. Elemental Analysis ②
Inductively Coupled Plasma-Optical Emission Spectrometer
Agilent Technologies

Agilent 720 ICP(No. 114)
■ Specifications/Features
Attachement:
PC for data analysis, Autosampler, Ultrasonic nebulizer, hydride generator

echelle polychromator
Axially-viewed plasma
simulaneous measurement of full wavelength coverage by sealed CCD detector
Wavelength coverage : 167 - 785 nm
Wavelength resolution : < 0.007 nm (@200 nm)
RF frequency : 40 MHz
Maximum power : 2.0 kW "■ FeeAnalysis by user

4,000 yen/nour(Free of charge for users from Graduate school of Pharmaceutical Sciences)

Analysis by staff■ Instrument location

None
Pharmaceutical Sciences, 2 Building, Room 102
4,000 yen/nour(Free of charge for users from Graduate school of Pharmaceutical Sciences)2｜Guide to Joint Use of Reuse Instruments

1. Elemental Analysis ③Electron Probe Microanalyzer (EPMA)JEOL JXA-8800R(No. 6)■ Specifications/Features
4ch detector, 8 spectroscopic crystals (TAP, LIF, LIFH, PET, PETH, LDE1H,
LDE2H, LDE1)
Measured elements: boron (atomic number 5) to uranium (atomic number 92)
Electron beam acceleration voltage (0.2-40 kV)
LaB6 electron gun, secondary beam image resolution 6 nm (can measurereflected electron beam image)
Cathode luminescence (300 nm-900 nm)
Analyzable area (80 mm × 80 mm)
Enables quantitative analysis of thin films■ Fee
Analysis by user

1,000 yen/hour
However, Institute of Scientific and Industrial Research’s Incubation
Building and Techno Alliance Building, and other on-campus
company-affiliated persons: Analysis by user: 2,500 yen/hour

Analysis by staff

3,000 yen/hour
However, Institute of Scientific and Industrial Research’s Incubation
Building and Techno Alliance Building, and other on-campus
company-affiliated persons: Analysis by user: 7,500 yen/hour■ Instrument location

Institute of Scientific and Industrial Research,
Comprehensive Analysis Center, Room 102

Wavelength Dispersive X-ray Fluorescence (WDXRF) Spectrometer
Rigaku Supermini(No. 93)■ Specifications/Features
This instrument is for wavelength dispersive X-ray fluorescence analysis.
This equipment uses a horizontal bottom surface irradiation system where theanalysis surface of the sample is faced downward, and measurement is performedby irradiating with X-rays from beneath.
X-ray tube: Pd target, 200 W
Measurement atmosphere: Vacuum
Detected elements: F through U■ Fee
Analysis by user

5,000 yen/hour

Analysis by staff

5,000 yen/hour(The fee is the basic rate. An extra fee will be charged
depending on the analysis content and difficulty.)■ Instrument location

Office for University-Industry Collaboration,
A Building, A-004

3｜Guide to Joint Use of Reuse Instruments

1. Elemental Analysis ④
Organic Trace Element Analyzer (CHN Analyzer)
Yanaco CHN Corder MT-5(No. 102)
■ Specifications/Features･Measured elements: Hydrogen, carbon, nitrogen･Measurement method:
Differential thermal conductivity method, self-integration method･Measurement precision: Absolute error, less than ±0.3%･Minimum sample required: Organic material, approximately 2 mg
･Measurement range:
Hydrogen 0.5-400 µg, carbon 3-2,600 µg, nitrogen 1-1,000 µg■ Fee
Analysis by user

None

Analysis by staff

Measurement/analysis
1. C, H, O, N, S, Cl, Br, I: 3,000 yen/sample
2. Measurement/analysis containing elements other than above: 4,000
yen/sample*There will be an extra fee when ash is produced (1,000 yen/sample)**Cannot be used with samples containing elements such as Se, Ru, Re, Os,
Hg, and samples with high hygroscopicity or volatility.
■ Instrument location

Science, c Building,Room 230

4｜Guide to Joint Use of Reuse Instruments

2. Mass Spectrometry ①
MALDI-TOF/TOF Mass Spectrometer （Bruker Ultraflex TOF/TOF）
Bruker Ultraflex TOF/TOF(No. 3)■ Specifications/Features
Enables MALDI-TOF/TOF mass spectrometry.
(See: http://www.bruker.co.jp/daltonics/product/ultraflex3.html)
The system is equipped with an automatic analysis robot ("twister"), andtherefore can also analyze multiple samples.
(If there is a need for high-precision analysis to approximately 6 significant
digits, it is recommended to use FT-ICR MS (No. 36) (consult with staff).)■ Fee
Analysis by user

3,000 yen/hour(Contact us regarding the fee for analysis with an assistant.)

Analysis by staff■ Instrument location

30,000 yen/sample
Science,H Building,Room 307

MALDI-TOF Mass Spectrometer（Applied Biosystems Voyagr DERP）
Applied Biosystems Voyagr DERP(No. 46)■ Specifications/Features
Enables measurement and identification of biomolecules, organic moleculesand similar substances with a molecular weight of about 500 or more.

■ Fee
Analysis by user

500 yen/sample(same for users from the Graduate School of Science)
Technical guidance fee: 1,000 yen/hour

Analysis by staff■ Instrument location

None
Science, B Building,Room 132, Joint Experiment Laboratory

5｜Guide to Joint Use of Reuse Instruments

2. Mass Spectrometry ②
MALDI-TOF Mass Spectrometer
Shimadzu KRATOS AXIMA-CFR(No. 101)■ Specifications/Features
Measurable range of m/z: 10-300,000
Maximum resolution: 10,000 (in reflectron mode; about 3,000 in linear mode)

Operation is comparatively easy, and the system is useful for analyzing awide-range of compounds. The unit is also equipped with an automatic analysis
system enabling automatic analysis of a maximum of 384 samples.

■ Fee
Analysis by user

Total: 1+2
1. Basic rate: 500 yen/sample
2. Hourly basic rate: 2,000 yen/hour

Analysis by staff

Total: 1+2
1. Basic rate: 2,000 yen/sample
2. Hourly basic rate: 2,000 yen/hourr
For other supplies provided in the analysis laboratories, users should pay
according to the amount used

■ Instrument location

Science, Interdisciplinary Research Building 3F, Room NMR/MS

ESI-Q-TOF Mass Spectrometer（Waters Q-TofUltimaAPI）
Waters Q-TofUltimaAPI(No. 49)■ Specifications/Features
This instrument enables the high-resolution mass spectrometry needed forstructural analysis of organic compounds and biomolecules, all the way as far as
ultra-minute amounts.
It can be used in linkage with an HPLC as an LC-MS, and also has an MS/MS
function. Therefore it has general applicability in a wide range of fields
including analysis of peptide structure.
■ Fee
Analysis by user

Consult with staff.

Analysis by staff

20,000 yen/sample■ Instrument location

Pharmaceutical Sciences, 307

6｜Guide to Joint Use of Reuse Instruments

2. Mass Spectrometry ③
ESI-Q-TOF Mass Spectrometer（Waters Q-Tof UltimaAPI）
Waters Q-Tof Ultima API(No. 68)■ Specifications/Features
This instrument enables the high-resolution mass spectrometry needed forstructural analysis of organic compounds and biomolecules, all the way as far as
ultra-minute amounts.
It can be used in linkage with an HPLC as an LC-MS, and also has an MS/MS
function. Therefore it has general applicability in a wide range of fields
including analysis of peptide structure.
■ Fee
Analysis by user

None

Analysis by staff

20,000 yen/sample■ Instrument location

Engineering, A14-116

ESI-Qq-TOF Mass Spectrometer（Bruker micrO-TOFQ II ）Bruker micrO-TOFQ II(No. 35)■ Specifications/Features
Enables measurement of mass from small molecules to macromolecules (e.g.,proteins).
The unit is linked on-line with a nano LC, and the analysis section is the hybrid
type which can handle both the quadrupole type and the time-of-flight type.
LC-MS/MS can be performed with high-precision and high-speed, and the
instrument can be used for analyzing a variety of biomolecules, etc.

■ Fee
Analysis by user

None

Analysis by staff

30,000 yen/sample(Contact us about the fee for data analysis
and data analysis by an assistant.)■ Instrument location

Science, D Building,Room 103

7｜Guide to Joint Use of Reuse Instruments

2. Mass Spectrometry ④
ESI-IT Mass Spectrometer
BrukerEsquire3000plus(No. 121)
■ Specifications/Features
This machine is equipped with electrospray ionization and ion trap analyzer,
and is applicable to structural analysis of drugs and proteins.
This machine can produce fragment ions and MS/MS analysis is possible,and hence is competent to analyze drug metabolites.
■ Fee
Analysis by user

10,000 yen/hour

Analysis by staff

10,000 yen/hour
Please contact us before use.

■ Instrument location Graduate School of Pharmaceutical Sciences,
1st Building, 5F, Room 505

ESI-FT-ICR Mass Spectrometer（Bruker micrO-TOFQⅡ）
Bruker Daltonics APEX IV-hR(No. 36)■ Specifications/Features
This ESI-FT-ICR type mass spectrometer enables measurement of themolecular weights of biomolecules (proteins, sugars, DNA) at a precision ofroughly 6 significant digits or more.
It is equipped with a superconducting magnet, and is capable of precise
molecular weight analysis of entire molecules, proteome analysis, andmeasurement with mixtures of multiple molecules.

■ Fee
Analysis by user

None

Analysis by staff

Total: 1+2
1. Basic rate: 2,000 yen/sample
2. Hourly basic rate: 3,500 yen/hour
option(LC) 1,000 yen/sample
option(nanoLC) 3,000yen/sample
oftion(ETD/ECD )1,000 yen/sample
For other supplies provided in the analysis laboratories, users should pay
according to the amount used(Contact us about the fee for data analysis and data analysis
by an assistant.)■ Instrument location

Science, C Building,Room 103

8｜Guide to Joint Use of Reuse Instruments

2. Mass Spectrometry ⑤
ESI (or DART)-LIT-Orbitrap Mass Spectrometer
Thermo Fisher Scientific

LTQ-Orbitrap XL(No. 118)
■ Specifications/Features
Measurable m/z range: 10-4,000
Maximum resolution: 100,000 (@ m/z 400 using FT-MS mode)
Mass accuracy: ±0.0005 (@ m/z 400 using FT-MS mode)

Other attachments:
nano-UPLC… We can obtaine MS and MS/MS simultanously.
DART ion source… This attachment is suitable for through put
analysis of lower molecular weight conpounds.
■ Fee
Analysis by user

Basic rate: 500 yen/sample + hourly-basic rate 3,500 yen/hour

Analysis by staff

Basic rate: 2,000 yen/sample + hourly-basic rate 3,500 yen/hour
For other supplies provided in the analysis laboratories, users should pay
according to the amount used

■ Instrument location

Science, Interdisciplinary Research Building, 3F, Room:NMR/MS

High Resolution Double Focusing Magnetic Sector Mass Spectrometer with Fast Atom Bombardment (FAB) Ion Source (Low-MS)

JEOL JMS-700(No. 15)■ Specifications/Features
Double focusing mass spectrometer
Ionization mode: FAB
Normal measurement (molecular weight: 200-2,000)
High-resolution measurement■ Fee
Analysis by user

None

Analysis by staff･Normal measurement (Low-MS): 5,000 yen/sample･High-resolution measurement (High-MS): 10,000 yen/sample■ Instrument location

Pharmaceutical Sciences, 143

9｜Guide to Joint Use of Reuse Instruments

2. Mass Spectrometry ⑥
Direct Analysis in Real Time (DART) Mass Spectrometer
JEOL Accu TOF-DART(No. 53)■ Specifications/Features
This is a mass spectrometer equipped with a DART (Direct Analysis in Real
Time) ion source, specially for high-resolution time-of-flight mass
spectrometers, made by JEOL USA, Inc.
DART is a new ion source which enables speedy, non-contact analysis of asample under atmospheric pressure and ground potential. By combining
AccuTOF and DART, it is possible to accurately estimate elemental
composition based on precise mass.
The system is applicable to gases, liquids and solids. It enables analysis without
pretreatment (such as sampling or solvent extraction), particularly of chemical
substances on the surface of matter. This is effective for screening andhigh-throughput analysis.
■ Fee
Analysis by user

600 yen/sample
However, Institute of Scientific and Industrial Research’s Incubation
Building and Techno Alliance Building, and other on-campus
company-affiliated persons: 1,500 yen/sample

Analysis by staff■ Instrument location

None
Institute of Scientific and Industrial Research,
Comprehensive Analysis Center, Room 303

10｜Guide to Joint Use of Reuse Instruments

3. NMR ①
400 MHz Liquid-state NMR Spectrometer(JEOL ECS-400)
JEOL ECS-400(No. 30)■ Specifications/Features
This instrument is for non-destructive research in which radio waves of atomic
nuclei placed in a magnetic field are used to measure what sort of environment
the nuclei, which are the focus of study in the fields of organic and inorganic
chemistry, are placed in. Diverse types of information can be obtained byirradiating using combinations of electromagnetic waves with various
waveforms. Since the system uses Windows software, it operates quickly, andease of operation is improved. This system is used for training in student
experiments.
･1H resonance frequency: 400 MHz; 13C resonance frequency: 100 MHz(Magnetic field strength: 9.4 T)･Delta Ver. 5.0.4.2 (Windows 7)･Auto-tune 5 mm FG/TH tunable probe･10 mm probe for low-frequency nuclei･5 mm FG/TFH 3-nuclei probe for two-channel CFH measurement･Heater for variable temperature measurement (10 L, 30 L)･Unit for long-term low-temperature measurement (down to –50°C)･Auto sample changer■ Fee
Analysis by user

1,800 yen/hour(1,650 yen/hour for continuous use of over 8 hours per sample)

Analysis by staff

2,400 yen/hour(1,500 yen/hour for less than half an hour of use)

■ Instrument location

Engineering, C7-113

11｜Guide to Joint Use of Reuse Instruments

3. NMR ②
400 MHz Liquid-state NMR Spectrometer(JEOL ECS-400)
JEOL ECS-400(No. 70)■ Specifications/Features
This instrument is for non-destructive research in which radio waves of atomic
nuclei placed in a magnetic field are used to measure what sort of environment
the nuclei, which are the focus of study in the fields of organic and inorganic
chemistry, are placed in. Diverse types of information can be obtained byirradiating using combinations of electromagnetic waves with various
waveforms. Since the system uses Windows software, it operates quickly, andease of operation is improved. This system is used for training in student
experiments.
･1H resonance frequency: 400 MHz; 13C resonance frequency: 100 MHz(Magnetic field strength: 9.4 T)･Delta Ver. 5.0.4.2 (Windows 7)･Auto-tune 5 mm FG/TH tunable probe･10 mm auto-tune probe･Heater for variable temperature measurement (10 L, 30 L)･Unit for long-term low-temperature measurement (down to –35°C)■ Fee
Analysis by user

1,800 yen/hour(1,650 yen/hour for continuous use of over 8 hours per sample)

Analysis by staff

2,400 yen/hour(1,500 yen/hour for less than half an hour of use)

■ Instrument location

Engineering, C7-113

12｜Guide to Joint Use of Reuse Instruments

3. NMR ③400 MHz NMR-Liquid(Bruker Biospin AV-400M)
Bruker Biospin AV-400M(No. 77)■ Specifications/Features
400 MHz NMR for solutions (also equipped with BBFOplus probe formulti-nuclei observation).
Comprised of magnet and electromagnetic irradiation section with hydrogen
nuclear magnetic frequency of 400 MHz.
The system also has an inclined magnetic field unit, and units for exciting andobserving nuclei other than hydrogen (e.g., 15N, 13C, 19F, and 31P nuclei).
It is primarily used for determining the 3-dimensional structure of biomolecules
such as proteins, and analyzing functional structure. The system enables direct
as well as indirect measurement of multiple nuclides.
The system has an auto-tuning and matching function, and can easily be usedby persons who are not NMR specialists.
■ Fee
Analysis by user

1,000 yen/day(Fee for technical guidance: 5,000 yen/day)

Analysis by staff■ Instrument location

None
Institute for Protein Research, NMR Building 1F

400 MHz Solid-state NMR Spectrometer(JEOL RESONANCE ECS400)
JEOL RESONANCE ECS400(No. 120)
■ Specifications/Features
・OS：Windows7 Software：Delt Ver.5.0.5
・Auto sample changer（24 peaces）
Probe
・5 mm JEOL TH5AT/FG probe
S/N比：1H ≥ 370:1 13C ≥ 270:1 15N ≥35:1 31P ≥ 130:1
Measurement temperature range：-100 ºC to 150 ºC■ Fee
Analysis by user

None

Analysis by staff

Rates
1.Basic rate:2,000 yen/sample
2.Time-based rate: Less than 10 hours :200 yen/min.
Over 10 hours :200 yen/hour
3.Temperature-based rate :1 degree up 1,000 yen
1 degree down 2, 000 yen
Total fee: 1+2+3■ Instrument location

Science, D Building, Room 104

13｜Guide to Joint Use of Reuse Instruments

3. NMR ④400 MHz Liquid-state and Solid-state NMR Spectrometer(JEOL Resonance ECA400WB)
JEOL RESONANCE ECA400WB(No. 90)■ Specifications/Features･Solid probe
4mm JEOL HXMAS Probe
Maximum rotation speed：18kHz
Measurement temperature range：-100℃ to 150℃
5 mm Doty WL solid probe no spin
Measurement temperature range: –10°C to 150°C
7 mm Doty H/X CPMAS solid probe
Maximum rotation speed ≤ 7 kHz
Measurement temperature range: Room temperature to 150°C･Probe for semisolid substances
4 mm H/X FGMAS probe
S/N ratio: 1H ≥ 90:1
Maximum rotation speed ≤ 9 kHz (Kel-F cap), ≤ 18 kHz (Vespel cap)
Measurement temperature range: Room temperature to 50°C
･Solution probe
5 mm JEOL 40TH5AT/FG2WB Probe
S/N ratio: 1H ≥ 220:1 13C ≥ 180:1
Measurement temperature range: Room temperature to 100°C･Wide range temperature HXMAS /VT probe could not measure until now Measurement of
low frequency nuclei of 15 N or less is possible Main observation nuclei:
14N · 15N · 25Mg · 33S · 35Cl · 43Ca · 47Ti · 49Ti · 97Mo
■ Fee
Analysis by user

None

Analysis by staff

Total: 1+2+3+4+5
1. Basic rate: 2,000 yen/sample
2. Time-based rate: 200 yen/30 min. for less than 10 hours
200 yen/hour for over 10 hours
3. Temperature-based rate: 1 degree up 1,000 yen
1 degree down 2,000 yen
4. Cell use charge:
When using a solid cell, or semisolid cell: 10,000 yen/sample
5. Sample preparation cost: When adjustment is required: 2,000 yen/sample■ Instrument location

Science, C Building, Room 112

14｜Guide to Joint Use of Reuse Instruments

3. NMR ⑤500 MHz Liquid-state NMR Spectrometer(JEOL ECA-500)
JEOL ECA-500(No. 67)■ Specifications/Features
1H resonance frequency: 500 MHz･Delta Ver. 5.01 (Windows 7)･Equipped with 5 mm TH5ATFG2 auto-tuning･Measured temperature range: –20°C to 60°C (for measurement of trace
amounts of natural materials)･Instrument for measuring the solution NMR of protons and multiple nuclei･Equipped with long-term VT (requires no liquid nitrogen up to –50°C)･Measurable nuclides: 1H, 19F, 31P-109Ag■ Fee
Analysis by user

Consult with staff.

Analysis by staff

Total: 1+2+3
1. Basic rate: 2,400 yen/sample
2. Time-based rate:Less than 10 hours: 240 yen/30 min
Over 10 hours: 240 yen/hour
3. Temperature-based rate:1 degree up:

1,200 yen/degree

1 degree down: 2,400 yen/degree■ Instrument location

Science, D Building, Room 104

500 MHz NMR-Liquid(Agilent Technologies Unity-Inova 500)
Agilent Technologies Unity-Inova 500(No. 84)■ Specifications/Features
Variable temperature unit: –10 to 130°C
Probes: PEG probe (φ3 mm, φ5 mm)
Multi-nuclei probe
Probe for liquid chromatography NMR■ Fee
Analysis by user

Total: 1+2+3
1. Basic rate: 300 yen/case
2. Time-based rate: Less than 10 hours: 600 yen/hour
Over 10 hours: 300 yen/hour
3. Low-temperature measurement: 3,000 yen/case(Fees are half price for users from the Department of Materials Engineering
Science, Graduate School of Engineering Science. However, there is
assignment of coolant filling duty.)

Analysis by staff■ Instrument location

None
Engineering Science, Analysis Building

15｜Guide to Joint Use of Reuse Instruments

3. NMR ⑥600 MHz Liquid-state NMR Spectrometer(JEOL ECA-600)
JEOL ECA-600(No. 97)■ Specifications/Features
The JNM-ECA600 from JEOL is an FT-NMR system developed by exploiting
state-of-the-art digital technology and high frequencies. The JNM-ECA600
MHz NMR incorporates auto-tuning and matching, and has gradient shimming.
With this system, it is possible to easily obtain high-quality NMR spectra withgood reproducibility. In addition, it is possible to conduct the optimization ofpresaturation for water suppression, and measurement of difference spectra, etc.
Furthermore, the system has a CHF 3-channel probe, which is extremely
convenient for measuring compounds containing 19F.
■ Fee
Analysis by user

600 yen/hour

Analysis by staff

1,200 yen/hour
On-campus company-affiliated persons from facilities such as the Instituteof Scientific and Industrial Research’s Incubation Building and Techno
Alliance Building: Analysis by user: 1,500 yen/hour
Analysis by staff: 3,000 yen/hour■ Instrument location

Institute of Scientific and Industrial Research,
Comprehensive Analysis Center, Room 106

600 MHz Liquid-state NMR Spectrometer
Bruker BioSpin AVANCE III 600(No. 106)■ Specifications/Features
NMR spectrometer equipped with:Bruker Ultra-shield 14.1 T, 1H resonance frequency 600MHz,
13C resonance frequency 150MHzNMR spectrometer equipped with a low temperature gas generator for overnight low
temperature runs
The following probes are available for this technique.
Multinuclear Broadband Fluorine Observe BBFO-H&F
Inverse probe: 5 mm and 1.7 mm TXI■ Fee
Analysis by user

Analysis by user:
1,800 yen/hour
1,650 yen/hour for continuous use over 8 hours per sample.

Analysis by staff

Analysis by staff:
3,000 yen/hour
2,100 yen/hour for less than half an hour of use.

■ Instrument location

Engineering, Analysis Center C7-113

16｜Guide to Joint Use of Reuse Instruments

3. NMR ⑦600 MHz Liquid-state and Solid-state NMR Spectrometer(Agilent Technologies

VNS600)

Agilent Technologies VNS600(No. 75)■ Specifications/Features･OS: Red Hat, Software: VnmrJ Ver. 3.2C･Long-term VT (enables measurement without liquid nitrogen down to –50°C)
Probe･5 mm Varian 1H-19F{13C/15N} PFG Triple Resonance Probe
S/N ratio: 1H ≥ 1,080:1, 19F ≥ 1,080:1
Measurement temperature range: –10ºC to 80ºC
･5 mm Varian 15N, 13C(1H-19F) PFG Triple Resonance Probe
S/N ratio: 1H ≥ 330:1, 13C ≥ 320:1, 15N ≥ 32:1, 19F ≥ 330:1
Measurement temperature range: –10ºC to 130ºC･3.2 mm Varian 1H/31P-13C/13C-15N BioMAS Probe
Maximum rotation speed ≤ 25 kHz
Measurement temperature range: –80°C to 130°C･1.2 mm Varian HXY UltraFastMAS Probe
Maximum rotation speed ≤ 60 kHz
Measurement temperature range: 0ºC to 65ºC
■ Fee
Analysis by user

None

Analysis by staff

Total: 1+2+3+4
1. Basic rate: 3,000 yen/sample
2. Time-based rate: Less than 10 hours: 300 yen/30 min.
Over 10 hours: 300 yen/hour
3. Temperature-based rate: 1 degree up: 1,500 yen
1 degree down: 3,000 yen
4. Measurement cell: 20,000 yen/sample (1.2mmφcell)
10,000 yen/sample (other cell except 1.2mmφcell)■ Instrument location

Science, Interdisciplinary Research Building 3F, Room: NMR・MS

17｜Guide to Joint Use of Reuse Instruments

3. NMR ⑧700 MHz Liquid-state NMR Spectrometer(Bruker Biospin AVANCE 700)
Bruker Biospin AVANCE 700(No. 76)■ Specifications/Features･OS: CentOS, Software: TopSpin Ver. 2.0.1･Long-term VT (enables measurement without liquid nitrogen up to 0°C)
Probe･φ5 mm PH TXI 700S4 H-C/N-D Z-gradient
S/N ratio: 1H ≥ 1,300:1
Measurement temperature range: –40°C to 80°C
･φ5 mm CP TCI 700S4 H-C/N-D Z-gradient
S/N ratio: 1H ≥ 7,000:1, 13C ≥ 1,200:1
Measurement temperature range: –40°C to 80°C
■ Fee
Analysis by user

None

Analysis by staff

Total: 1+2+3
1. Basic rate: 4,000 yen/sample
2. Time-based rate: Less than 10 hours 1,400 yen/30min.
Over 10 hours 1,400 yen/hour
3. Temperature-based rate: 1 degree up 1,000 yen
1 degree down 2,000 yen■ Instrument location

Science, D Building, Room 104

200-MHz Solid-state NMR Spectrometer(Bruker BioSpin DSX-200)
Bruker BioSpin DSX-200(No. 13)■ Specifications/Features
H-1 resonance frequency: 200.13 MHz
C-13 resonance frequency: 50.3 MHz
Possible types of measurement:● Multinuclear solid-state high-resolution NMR spectra measurement(room temperature)
Applicable nuclides (C-13, N-15, Si-29, P-31, Xe-129, etc.)● H-1, H-2 wide-range NMR measurement(variable temperature: 150K to room temperature)■ Fee
Analysis by user

None

Analysis by staff

1,000 yen/hour■ Instrument location

Center for Education in Liberal Arts and Sciences,
Laboratory Bldg.1 Room110

18｜Guide to Joint Use of Reuse Instruments

3. NMR ⑨300 MHz Solid-state NMR Spectrometer（Chemagnetics Infinity 300）
JEOL CMX-300（Chemagnetics Infinity 300）(No. 4)■ Specifications/Features● OS: SunOS, Software: Spinsight Ver. 3.5.2● Long-term VT (enables measurement without liquid nitrogen down to –50°C)

Probes:● 4 mm Chemagnetics CPMAS Solids probe
Maximum rotation speed ≤ 18 kHz
Measurement temperature range: 35ºC to 160ºC● 5 mm Chemagnetics CPMAS Solids probe
Maximum rotation speed ≤ 10 kHz
Measurement temperature range: 35ºC to 160ºC● 2H wideline Chemagnetics probe
Measurement temperature range: –35ºC to 160ºC■ Fee
Analysis by user

Consult with staff.

Analysis by staff

Total: 1+2+3+4
1. Basic rate: 4,000 yen
2. Time-based rate: Less than 10 hours: 200 yen/30 min.
Over 10 hours: 200 yen/hour
3. Temperature-based rate: 1 degree up: 1,000 yen
1 degree down: 2,000 yen
4. Measurement cell: 10,000 yen/sample■ Instrument location

Science, C Building,Room 115

19｜Guide to Joint Use of Reuse Instruments

3. NMR ⑩400 MHz Solid-state NMR Spectrometer(Bruker Biospin AVANCE400WB)
Bruker Biospin AVANCE400WB(No. 119)■ Specifications/Features
・OS：Windows7

Software：Topspin Ver.3.1

Probe・4 mm Bruker WL Static solid Probe
Maximum rotation speed ≤ 20kHz
Measurement temperature range：-100 ºC to 150ºC
・4 mm Bruker H/X/Y CPMAS solid Probe
Maximum rotation speed ≤ 20kHz
Measurement temperature range：-100 ºC to 150ºC
・4 mm Bruker H/F/X CPMAS solid Probe
Maximum rotation speed ≤ 20kHz
Measurement temperature range：-100 ºC to 150ºC■ Fee
Analysis by user

None

Analysis by staff

Total: 1+2+3+4
1.Basic rate：2,000yen/sample
2.Time-based rate：Less than 10 hours: 200yen/30min.
Over 10 hours: 200yen/hour
3Temperature-based rate：1degree up: 1,000 yen
1degree down: 3000 yen
4.Measurement cell：5,000 yen/sample■ Instrument location

Science, C Building, Room113

20｜Guide to Joint Use of Reuse Instruments

3. NMR ⑪600 MHz Solid-state NMR Spectrometer(Bruker BioSpin AVANCE III 600WB)
Bruker BioSpin AVANCE III 600WB(No. 20)■ Specifications/Features
The Bruker BioSpin AVANCE III 600WB for state-of-the-art solid-state NMR
has a wide-bore magnet, and enables measurement in the range from –140°C to+150°C.
It also enables measurement of items which were previously difficult, including
protons, multi nuclei, and 2-dimensions.
The system can efficiently perform continuous treatment of multiple samples,and enables automatic, unmanned continuous measurement of multiple samples
during the night or on holidays.
It is possible to prepare samples which are unstable in air or humidity, and thesolid-state nuclear magnetic resonance system can be used with a wide range ofsamples.
■ FeeAnalysis by user

None

Analysis by staff

1,000 yen/hour
However, Institute of Scientific and Industrial Research’s Incubation
Building and Techno Alliance Building, and other on-campus
company-affiliated persons: 2,500 yen/hour■ Instrument location

Institute of Scientific and Industrial Research,
Comprehensive Analysis Center, Room 104

21｜Guide to Joint Use of Reuse Instruments

4. Electron Spin Resonance ①
Electron Spin Resonance (ESR) Spectrometer(JEOL JES-FA200)
JEOL RESONANCE JES-FA200(No. 89)■ Specifications/Features
Microwave unit: Basic frequency 8.75 - 9.65 GHz
Electromagnet: Variation range of magnetic field –10 to 1,300 mT
Cavity resonator (cavity): Resonance mode TE cylinder type
Variable temperature unit: Liquid helium variable temperature 2.5 to 400 K
Liquid nitrogen variable temperature 103 to 473 K
Attachments: Single axis goniometer for single-crystal samples
Electrochemical oxidation-reduction sample tube
Sample tube for aqueous solutions■ Fee
Analysis by user

1,000 yen/hour(First-time users must undergo instruction in operation to perform analysis
by user. Initial analysis by staff: 2,000 yen. Second and subsequent times:
Additional fee: 2,000 yen when technical guidance is needed.)

Analysis by staff■ Instrument location

5,000 yen/hour
Science, G Building, Room 007

Electron Spin Resonance (ESR) Spectrometer(JEOL Resonance JES-TE200)
JEOL RESONANCE JES-TE200(No. 79)■ Specifications/Features
This equipment is used to identify, structurally analyze and quantify radical
molecular species.
■ Fee
Analysis by user

500 yen/hour
An extra fee will be charged for temperature change measuring per 200 yen/hour.

Analysis by staff■ Instrument location

None
Pharmaceutical Sciences,
Room Joint Reuse B1-2 (Building 2, Room 102)

22｜Guide to Joint Use of Reuse Instruments

4. Electron Spin Resonance ②
X-band Electron Spin Resonance SpectrometerJEOL

RESONANCEJES X320(No. 123)
■ Specifications/Features
X-band cw spectrometer with a spectrum simulatiuon code, a time-resolved measurments unit
and low tempertature measurment units (at liq, nitorogen temp. or liq. He temp).
■ Fee
Analysis by user

\ 300 per hour for normal measuments at room temperature,

Analysis by staff

None■ Instrument location

Science,F Building, Room216

Electron Spin Resonance (ESR) Spectrometer(Bruker Biospin ELEXSYS E500)
Bruker Biospin ELEXSYS E500(No. 63)■ Specifications/Features
Equipped with continuous wave, X-band electron spin resonance unit and temperature control(for liquid helium and liquid nitrogen).
Equipped with SHQ cavity and dielectric module resonator.
In addition to high-sensitivity detection of radicals and transition metals, the system
can easily measure properties of radicals such as orientation, mobility and distance
between radicals.
■ Fee
Analysis by user

500 yen/hour
Technical guidance fee: 1,000 yen/hour

Analysis by staff■ Instrument location

None
Institute for Protein Research Room for NMR, 1st Floor,
Analytical Instruments Facility

23｜Guide to Joint Use of Reuse Instruments

5. Magnetic Resoanace Imaging Apparatus ①
Magnetic Resonance Imaging (MRI) System for Small Animals
Bruker Biospin Avance II 500WB(No. 85)■ Specifications/Features
11.7 T magnetic resonance imaging (MRI) system for small animals.
Enables MRI of small animals to the size of mice or rats.
Also can be used for cells, extracted tissues, and fixed samples, etc.

■ Fee
Analysis by user

None

Analysis by staff

50,000 yen/hour■ Instrument location

Open and Transdisciplinary Research Initiatives, OTRI
Immunology Frontier Research Center, 11.7T

6. X-ray Diffraction ①
X-ray Diffractometer for Structural Analysis of Ultramicrocrystals
Rigaku RAPID 191R/FR-E(No. 8)■ Specifications/Features
X-ray source (can switch between the two wavelengths of Mo and Cu;
currently Mo)
Equipped with curved IP (imaging plate) detector. Suitable for absolute
structure determination of small organic molecules and crystals with a large
lattice constant.
X-ray generator, etc.: Rigaku FR-E++ Super Bright (45 kV, 55 mA, 2.475 kW)
Rotor cathode (supports Cu and Mo wavelength switching)Sample irradiation beam diameter: 0.21 mm
Imaging plate detector, etc.:
Curved IP detection area (750 mm × 382 mm), camera length (191 mm),measurement range (165°)
Dynamic range (1-1,000,000) AU (analog digital unit/pixels)
Goniometer section, etc.: 1/4χ gonio
Spray-type cooling unit (–170°C to R.T)

■ Fee
Analysis by user

2,400 yen/hour

Analysis by staff

4,800 yen/hour■ Instrument location

Science, C Building, Room 117

24｜Guide to Joint Use of Reuse Instruments

Room, MRI

6. X-ray Diffraction ②
Single-crystal X-ray Diffractometer Equipped with Charge-Coupled-Device (CCD) Detector
Rigaku AFC7R & MERCURY 2(No. 21)■ Specifications/Features
CCD detector (semiconductor detector), high-intensity X-ray generator (60 kV,
300 mA, Mo, Cu)
Computer for control (Crystal Clear Ver. 1.4) and analysis
4-axis goniometer
Nitrogen gas spray-type cooling unit (–170°C to 200°C)■ Fee
Analysis by user

500 yen/hour

Analysis by staff

500 yen/hour
Separate fee of 1,000 yen/hour for operator
However, Institute of Scientific and Industrial Research’s
Incubation Building and Techno Alliance Building,and other on-campus
company-affiliated persons: Analysis by user: 1,000 yen/hour
Analysis by staff: 3,000 yen/hour■ Instrument location

Institute of Scientific and Industrial Research,
Comprehensive Analysis Center, Room 203

High Intensity Single-crystal X-ray Diffractometer with Flat /Curve IP Detector
Rigaku FR-E & R-AXIS IV++(No. 74)■ Specifications/Features
High-brightness X-rays (45 kV, 55 mA, Cu)
IP area (300 mm x 300 mm) x2
IP dynamic range (1 million cps or more)
Measurement control application: CrystalClear
Read resolution: 50, 100, 200 μm
Crystal sample size: Max. 300 μm(size of crystal completely bathed in X-ray beam)
Spray cooling unit: Temperature range –180°C to 200°C■ Fee
Analysis by user

1,200 yen/hour

Analysis by staff

3,600 yen/hour
However, Institute of Scientific and Industrial Research’s Incubation
Building and Techno Alliance Building, and other on-campus
company-affiliated persons: Analysis by user: 3,000 yen/hour
Analysis by staff: 9,000 yen/hour(only Curve IP)■ Instrument location

Institute of Scientific and Industrial Research,
Comprehensive Analysis Center, Room 203

25｜Guide to Joint Use of Reuse Instruments

6. X-ray Diffraction ③
Single-crystal X-ray Diffractometer
RigakuVariMax RAPIDⅡ(No. 107)
■ Specifications/Features
Rotating anode sources
X-rayy source: Mo
Max rated output: 1.2kW (50kV-24mA)
Equipped with a confocal mirror system
Detector
Curved imaging plate
Dynamic range: 1～106
Camera length: 127.4 mm
Goniometer
1/4 goniometer
Low temperature device： -170 – R.T ˚CSoftware
RAPID AUTO software for image data processing and structure refinement■ Fee
Analysis by user

2,000 yen/hour

Analysis by staff

4,000 yen/hour■ Instrument location

Science,C Building, Room 116

Micro Area X-Ray Diffractometer
Rigaku RINT-RAPIDⅡ(No. 124)
■ Specifications/Features
Rotating anticathode sources
X-ray source: Mo or Cu (default: Mo)
Maximum rating output: 1.2kW (50kV-24mA for Mo)
Equipped with a confocal mirror system
Detector
Curved imaging plate (IP)
Dynamic range: 1050000 (20bit)
Camera length: 127.4mm
Goniometer: 5 axis (ω, φ: stepping motor driven)
Collimator size: φ10, 30, 50, 100, 300, 800 μm
SoftwareMeasurement and data processing: RAPID/XRD (Windows7)
General-purpose 2D data processing: 2DP
Integrated powder X-ray analysis software: PDXL ver.2.1■ Fee
Analysis by user

2000 yen/hour

Analysis by staff

None■ Instrument location

Science, F Building, Room 429

26｜Guide to Joint Use of Reuse Instruments

6. X-ray Diffraction ④
Powder X-ray Diffractometer
Rigaku RINT2000(No. 28)■ Specifications/Features
Powder X-ray diffractometer. This enables data analysis, such as Rietveld
conversion and lattice constant refinement, by using diffraction data. Integrated
powder X-ray analysis software (PDXL) is installed, and it is also possible tocarry out qualitative analysis and crystal structure analysis of powder samples,
including unknown substances, using the crystal structure database of the ICSD
(International Center for Diffraction Data).

■ Fee
Analysis by user

1,000 yen/hour(consultation is necessary in the case of joint research, etc.)

Analysis by staff■ Instrument location

None
Dentistry, C215

Multi-purpose X-ray Diffractometer(PANalytical X'pert PRO MPD)
PANalytical X'pert PRO MPD(No. 44)■ Specifications/Features
ψ-axis precision: ±0.05°
Step size: 0.01 to 90°
Angular range: –5 to +95°
φ-axis precision: ±0.05°
Step size: 0.01 to 180°
Angular range: 0 to n×360°
Sample height: < 25 mm
Sweep rate: 12 deg/sec■ Fee
Analysis by user

500 yen/hour(Free for charge for users from the Division of Sustainable
Energy and Environmental Engineering,
Graduate School of Engineering)

Analysis by staff■ Instrument location

None
Engineering, A12 Building, Laboratory No. 3

27｜Guide to Joint Use of Reuse Instruments

6. X-ray Diffraction ⑤
Multi-purpose X-ray Diffractometer(Rigaku SmartLab)
Rigaku SMART LAB(No. 71)■ Specifications/Features
This system uses X-ray diffractometry, and enables qualitative and quantitative
analysis of powder samples, and measurement of thin film sample composition,orientation, film thickness, etc.
X-ray tube: Cu, Maximum rated output: 9 kW (tube voltage: 20-45 kV, tube
current: 10-200 mA)
Goniometer section:
χ-axis angular range: -5 to +95°
Φ-axis angular range: 0 to 360°
Z-axis movement range: –4 to +1 mm
Rx, Ry: –5 to +5°
Detector: Scintillator (NaI), D/tex Ultra
Control software: SmartLab Guidance Ver. 1.5.5.6
Control and analysis computer (Windows 7)
System for high-temperature measurement (up to 900°C)
Switching between a focused optical system and a parallel beam optical system
can be easily done using a slit, and it is possible to conduct data analysis such as
Rietveld conversion of diffraction data, and refinement of the lattice constant.
*Analysis by user is only available for those who have finished the training
course for SmartLab use jointly sponsored with the Comprehensive Analysis
Center of the Institute of Scientific and Industrial Research.

■ Fee
Analysis by user

1,000 yen/hour
However, Institute of Scientific and Industrial Research’s Incubation
Building and Techno Alliance Building, and other on-campus
company-affiliated persons: Analysis by user: 2,500 yen/hour

Analysis by staff■ Instrument location

None
Institute of Scientific and Industrial Research,
Comprehensive Analysis Center, Room 203

28｜Guide to Joint Use of Reuse Instruments

6. X-ray Diffraction ⑥
X-ray Diffractometer for Structural Analysis of Single Crystals under Low- Temperature and High-Pressure

Rigaku order-made system(No. 31)■ Specifications/Features
X-ray generator: Mo rotating anticathode type (rated output: 18 kW)
Detector: Imaging plate (R-AXIS IV)
High-pressure generator: Diamond anvil type (ultimate pressure: about 100
GPa)
Freezer: Pulse tube type (attained temperature: approx. 10K)

■ Fee
Analysis by user

None

Analysis by staff

2,000 yen/hour(consultation is necessary in the case of joint research, etc.)■ Instrument location

Engineering Science,Center for Science and Technology under Extreme Condition,
Extreme Research Complex (Combined Extreme Production Room)

7. Electron Microscope ①
Scanning Electron Microscope (SEM)(JEOL JSM-5310LV)JEOL JSM-5310LV(No. 51)■ Specifications/Features
Acceleration voltage: 30 kV
Equipped with digital image observation system (Digicapture)■ Fee
Analysis by user

5,000 yen/hour
Free of charge for users from the Department of Mechanical Scienceand Bio engineering, Graduate School of Engineering Science

Analysis by staff■ Instrument location

None
Engineering Science, D Building,Room 103

29｜Guide to Joint Use of Reuse Instruments

7. Electron Microscope ②
Scanning Electron Microscope (SEM)(Hitachi High-Technologies S-2150)
Hitachi High-Technologies S-2150(No. 78)■ Specifications/Features
Filament: Thermal electron gun W (tungsten)
Secondary electron resolution: 100 nm
Power: x30 - x200K
Acceleration voltage: 0.5-25 kV■ Fee
Analysis by user

200 yen/hour
However, Institute of Scientific and Industrial Research’s
Incubation Building and Techno Alliance Building, andother on-campus company-affiliated persons: 500 yen/hour

Analysis by staff■ Instrument location

None
Institute of Scientific and Industrial Research,
Comprehensive Analysis Center, Room 102

Field Emission Scanning Electron Microscope (FE-SEM)(Hitachi High-Technologies SU6600)
Hitachi High-Technologies Analytical Variable Pressure FE-SEM SU6600(No. 58)■ Specifications/Features
Supports each observation mode: high vacuum and low vacuum
Secondary electron resolution: 1.3 nm at high vacuum, 3 nm at low vacuum
Power: x10 - x600,000, digital camera specifications
Equipped with cool stage (normally not provided).
When equipped with standard stage, observation can be done by inclining thestage.
Has a number of analysis tools for length measurement, etc.
■ Fee
Analysis by user

1,500 yen/hour

Analysis by staff

3,000yen/hour■ Instrument location

Science, A Building, Room 324

30｜Guide to Joint Use of Reuse Instruments

7. Electron Microscope ③
Field Emission Scanning Electron Microscope (FESEM)(Hitachi High-Technologies S-4200)
Hitachi High-Technologies S-4200(No. 43)■ Specifications/Features
Power: x20 - x500,000
Resolution: 5 nm (1 kV), 1.6 nm (15 kV)■ Fee
Analysis by user

500 yen/hour
Free for charge for users from the Division of Sustainable
Energy and Environmental Engineering,
Graduate School of Engineering

Analysis by staff■ Instrument location

None
Engineering, A12 Building, Laboratory No. 3

Energy-dispersive X-ray Spectrometer
HORIBA EMXA-5770(No. 42)■ Specifications/Features
Detected elements: Boron (Z=5) to Uranium (Z=92)
Energy resolution: < 144 eV■ Fee
Analysis by user

1,000 yen/hour
Free for charge for users from the Division of Sustainable Energy andEnvironmental Engineering, Graduate School of Engineering

Analysis by staff■ Instrument location

None
Engineering, A12 Building, Laboratory No. 3

31｜Guide to Joint Use of Reuse Instruments

7. Electron Microscope ④
Field Emission Scanning Electron Microscope (FESEM) with Energy-dispersive X-ray Spectrometer (EDS)(JEOL LSM-6335, JED-2300F)

JEOL JSM-6335, JED-2300F(No. 64)■ Specifications/Features
Field emission scanning electron microscope (JSM-6335)
Secondary electron image resolution: 1.5 nm (15 kV), 5.0 nm (1 kV)Power: x10 - x500,000
Acceleration voltage: 0.5-30 kV
EDS element analysis system (JED-2300F)
Energy resolution: 129 eV or less (10 m2)
Measured elements: Be-U, uses no liquid nitrogen
In addition, Ion Milling System has been introduced which enables surface andcross-section milling. This allows sophisticated sample pre-treatment of a wide
variety of samples, including metals, devices, and polymer composite materials.

■ Fee
Analysis by user

600 yen/hour
However, Institute of Scientific and Industrial Research’s Incubation
Building and Techno Alliance Building, and other on-campus
company-affiliated persons: Analysis by user: 1,500 yen/hour

Analysis by staff■ Instrument location

None
Institute of Scientific and Industrial Research,
S Building, Room 107-1

32｜Guide to Joint Use of Reuse Instruments

7. Electron Microscope ⑤
Field Emission Scanning Electron Microscope (FE-SEM) with Energy-dispersive X-ray Spectrometer (EDS)(JEOL JSM-7600F)

JEOL JSM-7600F(No. 98)■ Specifications/Features
Secondary electron resolution: 1.0 nm @ 15 kV, 1.4 nm @ 1 kV
Observation power: x25 - x1M
Acceleration voltage: 0.1-30 kV
Detectors: Secondary electron detector,
retractive reflection electron detector, EDS
The system has a field emission electron gun and a semi-in-lens, and thus iscapable of producing high-intensity, high-resolution observation results.
By using the gentle beam mode, it is possible to observe the surface at ultra-low
energy (several hundred eV).
The system can perform simultaneous observation and capture of secondary
electrons, reflected electrons, topographic imaging, and composition imaging
using the retractive reflection electron detector.
By using a TEM grid holder, it is possible to easily observe samples in the same
sampling lot as that used for TEM observation.

■ Fee
Analysis by user

3,000 yen/hour

Analysis by staff

6,000 yen/hour※For other supplies provided in the analysis laboratories, users should pay
according to the amount used.

■ Instrument location

Science, Interdisciplinary Research Building 2F,
Microscope RoomTransmission Electron Microscope (TEM)(Hitachi High-Tech. H-7650)
Hitachi High-Technologies H-7650(No. 59)■ Specifications/Features
Acceleration voltage: 40-120 kV
Resolution: 0.2 nm (lattice image)
Monitor power: x9.5 million (photography with digital camera)
Does not support tomography.

■ Fee
Analysis by user

1,500 yen/hour

Analysis by staff

3,000yen/hour■ Instrument location

Science, A Building,Room 322

33｜Guide to Joint Use of Reuse Instruments

7. Electron Microscope ⑥
Transmission Electron Microscope (TEM)(JEOL JEM-2100)
JEOL JEM-2100(No. 99)■ Specifications/Features
Resolution: Particle image 0.23 nm, Lattice image 0.14 nm
Observation power: x50 - x1.5M
Acceleration voltage: 50-200 kV
The system uses a LaB6 filament allowing long-term stable use of the electrongun (having a long lifetime).
Enables crystal lattice observation at high spatial resolution.
Data can be captured and video footage can be taken in a short time using a
CCD camera.
In linkage with an SEM-EDS, it is possible to acquire internal information,
element composition and other data for samples in the same sampling lot.

■ Fee
Analysis by user

3,000 yen/hour

Analysis by staff

6,000 yen/hour
For other supplies provided in the analysis laboratories, users should pay
according to the amount used

■ Instrument location

Science, Interdisciplinary Research Building 2F,
Microscope Room

8. Electron microscopy sample preparation ①
wide diameter soft plasma etching device
Meiwa forsis co., LTD SEDE-P(No. 98 - 2)
■ Specifications/Features
Electric glow discharge,
The device can generate large diameter plasma with effective diametephi of 148mm.
available gas: atmospheric air
SEM (No.98-1)allows observation of living specimens in combination with plasma
etching device (No.98-2)

The device enables the following techniques.
1.Living-SEM (reｆ. Microscopy,2014,295-300)
2.Hydrophilizattion of TEM grids on other surfaees with hydrophohic characteristics.
3. Plasma cleaning of the surfaceof a material (for removal of contaminants dopositedon the surfue material)■ Fee
Analysis by user

sample×condition×100yen

Analysis by staff

None■ Instrument location

Science, Interdisciplinary Research Building 2F,
Microscope Room

34｜Guide to Joint Use of Reuse Instruments

8. Electron microscopy sample preparation ②
Dual Beam Machining and Observation Apparatus
U.S.A.FEI XL830(No. 108)■ Specifications/Features
Electron Beam performance: Voltage range 200V to 30kV, Ion Beam Performance:
Operating voltage of 5kV to 30kV, equipped with EDX system, micromanipulators,
equipped to deposit either metal (Pt, W) or insulator (combined tetraethyl
orthosilicate (TEOS) and compatible with 8-inch substrates.

FIB nanoprocessing, SEM observation and chemical composition characterization
can be carried out continuously or intermittently using dual beam
(FIB and electron beam) system.

Nanoscale patterning can be achieved via FIB etching or FIB-driven depositionof metals (Pt and W). Measurement of electrical properties and TEM sample preparation
can be done using micromanipulator within the chamber.

■ Fee
Analysis by user

10,000 yen/hour

Analysis by staff

None■ Instrument location

Graduate School of Engineering Science,Center for Scienceand Technology under Extreme Conditions,112

High Vacuum Coating System
Leica EM-MED 020(No. 60)■ Specifications/Features
Specifications optimized for applying the rotary shadowing method. Rapid
evacuation.
The amount of vapor deposition is measured and displayed as a numericalvalue, and thus rotary shadowing is performed without requiring a high level ofskill.

■ Fee
Analysis by user

500 yen/hour
Technical guidance fee: 1,000 yen/hour
Free of charge for users from the Department of Biological
Sciences, Graduate School of Science

Analysis by staff■ Instrument location

None
Science, A Building, Room 318

35｜Guide to Joint Use of Reuse Instruments

8. Electron microscopy sample preparation ③
High Pressure Freezing System
Leica EM-HPM100(No. 55)■ Specifications/Features
Cooling speed: 100,000 K/sec
Freezing is performed under high pressure (2,100 bar).
Operation is almost entirely automated.
An 8-mm sample stand can be used as an option.

■ Fee
Analysis by user

500 yen/hour
Technical guidance fee: 1,000 yen/hour
Free of charge for users from the Department of Biological Sciences,
Graduate School of Science

Analysis by staff■ Instrument location

None
Science, A Building, Room 318

Freeze Substitution System
Leica EM-AFS2(No. 54)■ Specifications/Features
Temperature range: –140°C to 70°C
Liquid nitrogen consumption: 0.3 L in 5 days
The system is not equipped with a freeze substitution processor (FSP) for
automating the substitution process.
(Tasks such as substitution must be performed manually.)
Easy setting of the temperature control program.
Temperature control is fully automated.
This system is also equipped with a kit to promote polymerization of resins with
UV.

■ Fee
Analysis by user

500 yen/hour
Technical guidance fee: 1,000 yen/hour
Free of charge for users from the Department of Biological Sciences,
Graduate School of Science

Analysis by staff■ Instrument location

None
Science, A Building, Room 318

36｜Guide to Joint Use of Reuse Instruments

9. Surface Analysis ①
X-ray Photoelectron Spectrometer (XPS)
Shimadzu KRATOS AXIS-165x(No. 94)■ Specifications/Features
By spectrally dispersing photoelectrons produced when the surface of a solid is
irradiated with X-rays in an ultra-high vacuum, it is possible to obtain
information at the extreme surface layer of the solid (a few tens of angstroms in
depth), and to qualify and quantify the composition of the solid surface. Al/Mg
and monochrome Al (monochromator) are provided as X-ray sources for
excitation, and these can be used to suit the application. In addition, theinstrument can analyze changes in composition in the depth direction by using
the included sputtered ion gun, and repeating analysis after thinly stripping off
the surface.

■ Fee
Analysis by user

6,000 yen/hour

Analysis by staff

6,000 yen/hour(The fee is the basic rate. An extra fee will be charged depending on theanalysis content and difficulty.)■ Instrument location

Office for University-Industry Collaboration,
A Building, A-004

Secondary Ion Mass Spectrometry（SIMS）
ATOMIKA SIMS410(No. 122)
■ Specifications/Features
the elements in solide sample are identidied by the mass spectrometry analysisof the second ion produced by the irradiation of the ion beam (primary ion)
depth direction analysis of the impurities of semiconductors or element
diffusion analysis in a multilayered membrane■ Fee
Analysis by user

2,000 yen/h5,000 yen /hfor On-campus company-affiliated persons from facilities such as the Instituteof Scientific and Industrial Research’s Incubation Building and Techno
Alliance Building

Analysis by staff■ Instrument location

None
The Institute of Scientific and Industrial Research,
Comprehensive Analysis Center, Room 102

37｜Guide to Joint Use of Reuse Instruments

10. Morphological Observation ①
Atomic Force Microscope (AFM)
Keyence VN-8000, VN-8010(No. 96)■ Specifications/Features
The main feature of this system is that measurements can be obtained undernormal atmospheric conditions and therefore it is easy to operate.
Sample size: Approx. 7 cm x 7 cm, Height: 15 mm
Stage movement range: X-Y-Z 20 mm
Observation range: X-Y 200 nm - 200 μm, Z ±10μm
Vertical (Z) resolution: 0.3 nm
Observation mode: Contact, DFM, SS■ Fee
Analysis by user

1,000 yen/hour

Analysis by staff

1,000 yen/hour(The fee is the basic rate. An extra fee will be charged dependingon the analysis content and difficulty.)■ Instrument location

Office for University-Industry Collaboration,
A Building, A-004

shimazu SPM-9500J3(No. 125)
■ Specifications/Features
SPM-9500J3 can be scan sample surfaces with an extremely sharp probe toobserve their three-dimensional image or local properties at high magnifications.
■ Fee
Analysis by user

1000 JPY/hour

Analysis by staff

None■ Instrument location

Graduate School of Dentistry C-215

38｜Guide to Joint Use of Reuse Instruments

11. Spectroscopic Analysis Apparatus ①
Micro-stopped-flow Fluorescence Spectrophotometer
Applied Photophysics SX17MV(No. 33)■ Specifications/Features
This instrument enables measurement of high-speed reactions between
biomolecules using methods such as absorbance, fluorescence, and circulardichroism.
It is possible, using these methods, to detect high-speed reactions which occur
over periods ranging from 1/1000 of a second to a few minutes.
No problems occur, even if solutions with high and low salt concentration are
mixed, and it is possible to analyze the renaturation and denaturation of protein.
■ Fee
Analysis by user

2,000 yen/day(Contact us about the fee for analysis by an assistant.)

Analysis by staff■ Instrument location

3,000 yen/hour
Science, D Building, Room 103

Stopped-flow Rapid-scan Spectroscopy System
Unisoku RSP1000D(No. 11)■ Specifications/Features
Laser source:
Surelite I Nd-YAG made by HOYA Continuum (5 ns pulse)
System enabling dye laser spectroscopy:
Rapid-scan photomultiplier spectroscope made by Unisoku Co., Ltd.
(spectroscope: Unisoku MD200)
Photomultiplier: Photomultiplier made by Unisoku (nsec, sub-nsec, µsec)
Tektronix digital oscilloscope
Multi-channel photometry section: MOS type, high sensitivity
Photodiode array (scan 1 msec)■ Fee
Analysis by user

None

Analysis by staff

1,500 yen/hour■ Instrument location

Engineering, C4-627

39｜Guide to Joint Use of Reuse Instruments

11. Spectroscopic Analysis Apparatus ②
Circular Dichrometer(Jasco J-805)
Jasco J-805(No. 40)■ Specifications/Features
Measured wavelengths: 185-400 nm (150 W Xe Lamp)
Resolution: <1 nm■ Fee
Analysis by user

200 yen/hour

Analysis by staff

None■ Instrument location

Engineering Science, C Building, Room 522

Circular Dichrometer(Jasco J-720W)
Jasco J-720W(No. 32)■ Specifications/Features
This instrument enables measurement of the circular dichromatic spectrum from
170 nm to 800 nm, and measurement of the structure of nucleic acids, proteinsand DNA.
For example, it is possible to estimate the percentages of protein secondary
structures (α-helix, β-sheet), and analyze the presence/absence of denaturation.
In addition, it is also possible to evaluate phenomena such as formation of the
double-helix of DNA. The minimum necessary amount of sample is 10 µg.

■ Fee
Analysis by user

2,000 yen/day(Contact us about the fee for analysis with an assistant.)

Analysis by staff■ Instrument location

3,000 yen/hour
Science, D Building, Room 103

40｜Guide to Joint Use of Reuse Instruments

11. Spectroscopic Analysis Apparatus ③
Circular Dichrometer(Jasco/Oxford Instruments J-720W/MS4000)
Jasco/Oxford Instruments J-720W/MS4000(No. 81)■ Specifications/Features
Measurement wavelengths: 170-1,000 nm
Spectrum width: 0.2-2 nm
CD scale: 1-1,000 m° / full-scale
Absorbance: 0-5 ABS
Magnetic field: 0-7 T
Temperature: 4.2-300 K

This system is for performing magnetic circular dichroism spectroscopy. It
employs a technique for obtaining information relating to the magnetic properties
and electron structure of the photoexcited states of systems in which light andmagnetic properties are correlated, such as magnetic metal ions in inorganic
solids, π-conjugated compounds, and metal complexes.
The system enables application of magnetic fields up to 7 T, and temperature canbe adjusted between 1.5 K and 300 K. The system allows the user to control thetemperature without applying a magnetic field.

■ Fee
Analysis by user

None

Analysis by staff

30,000 yen/day or 120,000 yen/session(4-5 consecutive days of operation is available as one
session. For use for 1 day to 3 days please discuss the schedule with theadministrative chair.)■ Instrument location

Science, G Building, Room 310

41｜Guide to Joint Use of Reuse Instruments

11. Spectroscopic Analysis Apparatus ④
Laser Raman Spectrometer(Jasco NR-1800)
Jasco NR-1800(No. 72)■ Specifications/Features
Equipment for measuring vibrational energy in structural chemistry research on
molecules.
Enables measurement of the chemical structure which is the foundation ofresearch fields at the molecular level.
Since the system has lasers with multiple wavelengths, it can induce theresonance Raman effect.

Kr laser: 406.7 nm, 413.1 nm
He-Cd laser: 441.6 nm
Triple spectroscope (1 cm-1/pixel)
Detector: CCD detector (maximum sensitivity near 400 nm)■ Fee
Analysis by user

1,000 yen/hour

Analysis by staff

2,000 yen/hour■ Instrument location

Pharmaceutical Sciences, Building 1, Room 503

Laser Raman Spectrometer Jasco( NR-1800)
Jasco NR-1800(No. 82)■ Specifications/Features
Max. resolution: 0.2 cm-1, Wavelength precision: ±1 cm-1
Ar laser: 514.5 nm, 488.0 nm, 457.9 nm
He-Ne laser: 632.8 nm
Semiconductor laser: 405 nm, 532 nm, 660 nm
This is a Raman spectrometer for the visible range, equipped with a CCD and aphotomultiplier as detectors.
The system is equipped with a cryostat, and can perform measurement from room
temperature to ultra-low temperatures (approximately 5 K).

■ Fee
Analysis by user

None

Analysis by staff

Basic rate: 5,000 yen/hour
An extra fee is required for low temperature
measurement. Contact us about the fee.

■ Instrument location

Science, c Building, Room 227

42｜Guide to Joint Use of Reuse Instruments

11. Spectroscopic Analysis Apparatus ⑤
Fourier Transform Infrared (FT-IR) Spectrometer(Jasco FT/IR-6100)
Jasco FT/IR-6100(No. 83)■ Specifications/Features･ Measurement wave number range: 7,800-350 cm-1,
Maximum resolution: 0.5 cm-1
･ Measurement can be done using KBr tablets, Nujol mull method or Fluorolube
method. It is also possible to perform polarized measurement using ATR.
･ Equipped with cryostat. Measurement can be done from room temperature toultra-low temperatures (approximately 5 K).

With the coupling of an FTIR spectrometer to an infrared microscope,
the system is able to examine microscopic areas of materials down to
the micrometer level.
FTIR imaging allows the visualization of chemical information on the spatial
distribution about the constituents.

The following are examples of application areas for FT-IR microscopy.
・High-sensitivity measurement of a thin film sample on a metal substrate・identification and imaging of trace contaminants
・Analysis of a thinner multi-layer film having a thickness of about 10 micrometers or less

The following three additional new features were incorporated.

(1) DLATGS detector with no need for liquid nitrogen cooling and spectral acquisition to below 400 cm-1
(spectral range that is inaccessible with the MCT detector)(2) Coupling a Ge ATR objective with an infrared microscope provides exceptional sensitivity andspatial resolution for micro sample analysis, which cannot be achieved with macro-ATR analysis.
Furthermore, this technique can be also applied for surface characterization of samples(metal substrates, etc.) that are not suitable for transmission measurements.
(3) Diamond cell used to be compressed and flattened to a uniform thickness for FT-IR analysisof micro samples in transmission mode using a FT-IR microscope.
■ Fee
Analysis by user

2,500 yen/hour(Fee for technical guidance: 1,000 yen/hour)(Not possible for low temperatures)

Analysis by staff

Basic rate: 5,000 yen/hour
An extra fee is required for low temperature
measurement. Contact us about the fee.

■ Instrument location

Science, c Building, Room 227

43｜Guide to Joint Use of Reuse Instruments

11. Spectroscopic Analysis Apparatus ⑥
FTIR Spectrometer Attached to IR Microscope
Thermo Fisher Scientific (former VG) Magna750, Nic-plan(INFRARED MICROSCOPE)(No. 45)■ Specifications/Features
Enables analysis of light transmittance and reflectance in the mid-infrared
wavelength range (800-4,000 cm-1; the range may differ somewhat depending on
the sample). The instrument is also equipped with an infrared microscope, so it
also enables infrared spectroscopic analysis in the micro range (up to
approximately 50 µm2).

■ Fee
Analysis by user

1,000 yen/day

Analysis by staff

None■ Instrument location

Engineering, A14 (Accelerator Experiment Building),
Courtyard Lab.

Absolute Photoluminescence Quantum Yield Spectrometer
Hamamatsu Photonics Quantaurus-QY(C11347-01)(No. 92)■ Specifications/Features
Measures the absolute photoluminescence quantum yield of a photoluminescentmaterial using the photoluminescence (PL) method
PL measured wavelength range: 300-950 nm
Excitation wavelength: 250-850 nm
Sample types: Thin film, powder, liquid
Measurement at room temperature only

■ Fee
Analysis by user

1,000 yen/hour

Analysis by staff

1,000 yen/hour(The fee is the basic rate. An extra fee will be charged
depending on the analysis content and difficulty.)■ Instrument location

Office for University-Industry Collaboration,
A Building, A-004

44｜Guide to Joint Use of Reuse Instruments

11. Spectroscopic Analysis Apparatus ⑦
UV-Vis-NIR Spectrophotometer
HITACHI(No. 116)■ Specifications/Features
This instrument permits determination of spectral
transmittance and reflectance (at incident angleof 5degrees) of sample at UV and Vis-NIR region
from 240nm to 2600nm.
Light sources are WI lamp and Deuterium lamp, anddetectors are integrating sphere, photomultipliertube, and PbS. Combination of them is controlled
automatically depending on wavelength of light.
Line width of diagnostic light is adjustable bychanging width of exit slit of monochromatorinside this instrument from 0.1nm to 8.0 nm.
This instrument also permits alteration oftransmittance or reflectance from moment to moment.
Optional equipment permits determination ofspectral reflection at arbitrary point on 8-inch
wafer at incident angle of 5degrees. Ultra
broadband dielectric mirror as reference permits
determination of absolute reflectance from 400nm
to 1200nm.
Using polarizer permits polarization-dependenttransmittance and reflectance from 400nm to 700nm.
Measured data are recorded as ASCII data, and user
takes them directly from desktop computer by USB
flash memory. Operating system of computer is
Windows XP, and don't introduce a virus into
computer by your USB flash memory, please.
■ Fee
Analysis by user

1,000yen/hour

Analysis by staff

3,000yen/hour■ Instrument location

Graduate School of Engineering
Room M1-518, 5F, M1 Building

45｜Guide to Joint Use of Reuse Instruments

11. Spectroscopic Analysis Apparatus ⑧
Spectrofluorometer
HORIBA

FluoroMax-4(No. 117)
■ Specifications/Features
Spectrometers: Plane-grating Czery-Turner design、
Excitation & Emission: 200-950 nm, Bandpass: 0-30nm,
Scan speed: 80 nm/s, Integration time: 1 ms to 160 s,
Photomultiplier range: 200-850 nm,
Emission detector: photon counting, S/N ratio: 3000:1 (steady-state mode),
Computer-control with FluorEssenceTM software,■ Fee
Analysis by user

1,000 yen/day

Analysis by staff

None■ Instrument location Science, A Building, Room 217/219

12. Thermal Analyzers ①
High-sensitivity Isothermal Titration Microcalorimeter
MicroCal VP-iTC/1000(No. 16)■ Specifications/Features
This system is for obtaining thermodynamic information on bonds throughhigh-sensitivity measurement of the minute amounts of heat produced andabsorbed when there is interaction between molecules.
For higher sensitivity analysis of even more minute amounts, please use the
Ultrahigh-sensitivity Isothermal Titration Microcalorimeter (No. 66).

■ Fee
Analysis by user

500 yen/hour(Contact us about the fee for analysis with an assistant.)

Analysis by staff■ Instrument location

3,000 yen/hour
Science, D Building, Room 103

46｜Guide to Joint Use of Reuse Instruments

12. Thermal Analyzers ②
Ultrahigh-sensitivity Isothermal Titration Microcalorimeter
MicroCal iTC200(No. 66)■ Specifications/Features
Enables measurement with a cell capacity of 200 µl (VP-ITC ratio 1/7).
Measurement time is reduced to 15-30 minutes (VP-ITC ratio 1/2-1/4).
Measurement temperature range 2°C to 80°C, cell volume 200 µl, titer 0.1-40 µl[Features] In the field of molecular biology, this instrument enables observation ofbonding of proteins and ligands while in the solution state, and calculation of
the dissociation constant of proteins and ligands.
In addition, it measures changes in calorific value accompanying bonding, and thus itenables analysis of thermodynamic processes such as changes in enthalpy.
Uses are not limited to the field of molecular biology. Even in the field of chemistry
and physics, it is possible to measure a wide range of reactions, including
association of compounds and polymerization of molecules.
Among equipment currently on the market, this instrument has the best sensitivity,and both the sample amount and measurement time are greatly improved compared
to previous generation systems.

■ Fee
Analysis by user

500 yen/hour(Contact us about the fee for analysis with an assistant.)

Analysis by staff■ Instrument location

3,000 yen/hour
Science, D Building, Room 103

Nano-Differential Scanning Calorimeter (Nano-DSC)
CSC Nano-DSC(No. 17)■ Specifications/Features
This system is for varying the temperature of a sample, and quantitatively measuring theoutflow and inflow of heat produced at that time.
This enables, for example, analysis of thermal denaturation of protein, and reactions where
two chains of DNA become one chain due to temperature changes.

■ Fee
Analysis by user

500 yen/hour(Contact us about the fee for analysis with an assistant.)

Analysis by staff■ Instrument location

3,000 yen/hour
Science, D Building, Room 103

47｜Guide to Joint Use of Reuse Instruments

12. Thermal Analyzers ③
Thermal Analysis System (TG-DTA、DSC、TMA)
Rigaku Thermo Plus EVO Ⅱ(No. 95)■ Specifications/Features
Differential scanning calorimeter (DSC)
Working temperature range: –125°C to 450°C,
Max. rate of temperature rise: 100°C/min
Thermomechanical analysis (TMA)
Compressive load method: Fixed load, constant velocity load, sin wave periodic load
Working temperature range: Room temperature to 1,350°C,
Max. rate of temperature rise: 100°C/min
Thermogravimetry-Differential thermal analyzer (TG-DTA)
Working temperature range: Room temperature to 1,350°C,
Max. rate of temperature rise: 100°C/min
Max. amount of sample: 1 g
DSC, TMA, and TG-DTA can be used simultaneously.
Measurement atmosphere: Air, N2 gas■ Fee
Analysis by user

1,000 yen/hour(Contact us about the fee for analysis with an assistant.)

Analysis by staff

1,000 yen/hour(The fee is the basic rate. An extra fee will be charged depending on theanalysis content and difficulty.)■ Instrument location

Office for University-Industry Collaboration,
A Building, A-004

48｜Guide to Joint Use of Reuse Instruments

13. Bio-related analytical instrument ①
Fluorescence Microscope
Zeiss Axio Observer, D1 equivalent(No. 80)■ Specifications/Features
Fluorescence microscope equipped with AxioCam HRm high-sensitivity monochrome CCD
camera.
The following filters can be used:
Filter Set 01, Ex BP365/12 BS FT394 Em LP397 DAPI, AMCA
Filter Set 15, Ex BP546/12 BS FT580 Em LP590 Rhodamine, Alexa 546
Filter Set 09, Ex BP450-490 BS FT510 Em LP515 FITC, Acridin Orange, GFP
The attached AxioVision is used for photography and image analysis.
■ Fee
Analysis by user

500 yen/hour

Analysis by staff

None■ Instrument location

Immunology Frontier Research Center,
3F Room 309

Real-time Fluorescence Lifetime Imaging System
Hamamatsu Photonics Nikon Aqua Cosmos RATIO Basic System(No. 37)■ Specifications/Features
This system enables high-sensitivity detection of phenomena such as cellularresponse, by capturing changes in ion concentration and enzyme activity of celland tissue samples.

■ Fee
Analysis by user

1,500 yen/hour(Free of charge for users from the Division of Medical Pharmacy,
Graduate School of Pharmaceutical Sciences)

Analysis by staff■ Instrument location

None
Pharmaceutical Sciences, 2 Building 1F, B1-101

49｜Guide to Joint Use of Reuse Instruments

13. Bio-related analytical instrument ②
XL-I Analytical Ultracentrifuge
Beckman Coulter Optima XL-1(No. 2)■ Specifications/Features
By using analytical ultracentrifugation, it is possible to observe the form of
biopolymers such as proteins and DNA under physiological conditions. Thissystem can measure the form and molecular weight of single molecules andsupramolecular complexes, and also test their purity. As a more sophisticatedapplication, it enables observation of interactions between biopolymers (whether
or not complexes are formed).

■ Fee
Analysis by user

None

Analysis by staff

500 yen/hour■ Instrument location Institute for Protein Research, 519

XL-A Analytical Ultracentrifuge
Beckman Coulter Optima XL-A(No. 10)■ Specifications/Features
Xenon laser pulsed light source
Titanium rotor: 1,000-60,000 rotations/minuteSpectroscope: 190-800 nm
UV detector: 0-1.5 OD
Measurement temperature: 0°C to 40°C
PC and data automatic input/analysis program■ Fee
Analysis by user

None

Analysis by staff

500 yen/hour■ Instrument location

Institute for Protein Research, 519

BECKMAN COULTER Optima L-90K(No. 126)
■ Specifications/Features
Optima L-90K Ultracentrifuges enable you to perform more separations in less time.
Perfect for applications such as high-purity plasmid DNA, subcellular particles andvirus isolations, this versatile floor model operates with a broad range of superb rotors,
including zonal and continuous flow for large-volume separations.
■ Fee
Analysis by user

500/hourAnalysis by staff

None■ Instrument location

Graduate School of Pharmaceutical Sciences

50｜Guide to Joint Use of Reuse Instruments

13. Bio-related analytical instrument ③
Fully Automated Nucleic Acid Extraction System
KURABO NA-1000(No. 47)■ Specifications/Features
This system can fully automatically perform gene extraction from tail solution,in order to investigate the mouse genotype.
In addition, it can process 40 samples simultaneously.
It is also useful for shortening time spent on analysis of genetically engineered
animals.

■ Fee
Analysis by user

1,000 yen/10 samples (minimum badge)

Analysis by staff

None■ Instrument location

Pharmaceutical Sciences, 2 Building, Room 402

Genetic Analyzer for DNA Sequencing and Fragment Analysis (LongCapillary_No.1)
Applied Biosystems ABI PRISM 310Genetic Analyzer(No. 1)■ Specifications/Features
This system is a DNA sequencer that uses capillary electrophoresis.
It automatically fills the capillary tube with special polymer instead of theconventional acrylamide, and then performs sequencing and fragment analysis.
There is no need for troublesome and time-consuming preparation of slab gel, as
was previously done, and no variation in results due to slab gel quality.
Analysis is carried out for each sample. In terms of the analysis time for a single
sample, 500-700 bp can be sequenced in 3 hours, and 48 samples can be analyzed
if an auto-sampler is used.

■ Fee
Analysis by user

None

Analysis by staff

200 yen/analysis(Free of charge for users from the Division of Physiological Sciences,
Division of Pathophysiology and Therapeutics, Division of Preventive andEnvironmental Medicine, Division of Internal Medicine, and Division of
Surgical Medicine)■ Instrument location

Medicine, Center for Medical Research and Education,
D91-08

51｜Guide to Joint Use of Reuse Instruments

13. Bio-related analytical instrument ④
Surface Plasmon Resonance(SPR)GE Healthcare

Biacore 3000(No. 105)
■ Specifications/Features
Surface plasmon resonance (SPR) is a label-free method that facilitates
the elucidation of real-time kinetics of molecular interactions between
biomolecules (proteins, nucleic acids, peptides, carbohydrates, lipids andother biomolecules).
SPR can be used to various applications such as evaluation of steady state affinity,
evaluation of binding kinetics and nalysis of dissociation kinetics.

■ Fee
Analysis by user

500yen/hour

Analysis by staff

None■ Instrument location

Science, A Building, Room 311

52｜Guide to Joint Use of Reuse Instruments

13. Bio-related analytical instrument ⑤
MicroArray Analysis Platform
Affymetrix(No. 111)
■ Specifications/Features
This platform can be used in processes of gene sequencing and gene expression
analysis using DNA microarray (DNA chip).
The hybridization, washing, staining and scanning processes can be performed
using this system.

System Components
Hybridization: GeneChip Hybridization Oven 645
Washing and Staining: GeneChip Fluidics Station 450
Scanning: GeneChip Scanner 3000 7G System & GeneChip AutoLoader
Specifications
Scanner
Scan Rate: Typical times: 5 minutes for a 49-format array at 2.5 μm pixelation"Sensitivity: <0.5 chromophore equivalents/μm2 (CPSM) at a signal-to-noise
ratio of 2:1 at wavelengths appropriate to R-Phycoerythrin"
Excitation: 532 nm, 200 μW
Emission Filters: 570 nm, Long-Pass
Detector: Meshless Photomultiplier Tube, Red Enhanced
Displayed/Saved Dynamic Range: 16-bit, (65535:1)
Resolution Scanning at Pixelations: 2.5 μm ～ 0.5 μm
This platform can analyze all GeneChip® probe arrays for gene expression analysis
and DNA SNP analysis.
"48-array removable carousel for unattended loading and unloadingof experiments."
Oven
Oven Set Point Range: 30ºC - 70ºC

■ Fee
Analysis by user

6,000 yen/day

Analysis by staff

None■ Instrument location

Science, D Building, room 103

53｜Guide to Joint Use of Reuse Instruments

13. Bio-related analytical instrument ⑥
Flow CytometerBD

FACS Calibur(No. 115)
■ Specifications/Features
Laser source：Cooled Arlaser (Excitation wavelength：488 nm)
Detection of fluorescence wavelength：near 530 nm, near 585 nm,
Fluorescent dye etc. :FITC, PE, PI, etc
Sample tube for analysis：12 mm x 75 mm
Analysis system：Mac-Pro
Method for retrieving data: CD-R (For antivirus)■ Fee
Analysis by user

3000yen/hour
Free of charge for users from Graduate School of Pharmaceutical
Sciences

Analysis by staff■ Instrument location

None
Pharmaceutical Sciences, 1st building, 1st floor,Room 112

14. Liquid Chromatography ①
Fast Protein Liquid Chromatography (FPLC) System
GE Healthcare AKTA explorer 10Sfrac-950(No. 34)■ Specifications/Features
This instrument performs protein refining and biomolecule analysis.
A column is mounted, biomolecules are separated, and the eluate is analyzed inreal-time using absorbance. Detection sensitivity for absorbance is high, and thus
it is also possible to detect low-concentration biomolecules. The instrument canbe used in a wide range of separation and analysis tasks for proteins, DNA andother biomolecules.

■ Fee
Analysis by user

3,000 yen/day(Contact us about the fee for analysis by an assistant.)

Analysis by staff■ Instrument location

None
Science, A Building, Room 311

54｜Guide to Joint Use of Reuse Instruments

15. Laser equipment ①
OPO Pulse Laｓeｒ System
U.S.A. Continuum

Powerlite9010+

Sunlite-EX+

FX-1(No. 109)

■ Specifications/Features●Powerlite Precision 9010 (Pulsed YAG Laser (customized for OPO Excitation))
Laser safety class: 4This laser is loaded with an injection seeder (stabilized infrared laser diode).
Pulse repetition: 10 Hz or single shot
Output (max): 350mJ/pulse@355nm (3-5nsFWHM), 700mJ/pulse@532nm (4-6nsFWHM),
1400mJ/pulse@1064nm (5-7nsFWHM)
Beam diameter: about 8mm
Linewidth: 0.003cm-1 (injection seeded)
Pulse shape: gaussian (injection seeded)●Sunlite-EX (optical parametric oscillator and optical parametric amplifier)Output: 445-1750nm (5-55mJ/pulse, 3-6nsFWHM)
Linewidth: 0.075cm-1●FX-1 (frequency doubler or UV generator)
This system double the frequency of Sunlite-EX output.
Output: 225-445nm (2-9mJ/pulse, 3-5nsFWHM)※Actual wavelength and pulse energy of the laser pulse can be monitored
by a wavelength meter and thermopile energy monitor.

※Optional instruments: 30cm grating spectrograph, 30cm grating double
monochromator, gated image intensifier unit, back-illuminated cooled CCD camera,
visible streak camera, etc.
■ Fee
Analysis by user

3,600 yen/hour

Analysis by staff

10,000 yen/hour■ Instrument location

Engineering, Mechanical M2 Building, (Ultra clean room)

High Power Glass Laser System
Continuum custom system(No. 61)■ Specifications/Features
Maximum output: 150 J
Pulse width: Approx. 15 ns■ Fee
Analysis by user

3,000 yen/day

Analysis by staff

6,000 yen/day■ Instrument location

Engineering, E6-E113

55｜Guide to Joint Use of Reuse Instruments

15. Laser equipment ②
Laser Plasma EUV Light Source Apparatus
Coherent Custom Nd:YAG(No. 25)■ Specifications/Features
This system can output, at a 10-Hz cycle, laser pulses of 200 mJ/40 ps or 800
mJ/300 ps. The basic wavelength is 1064 nm, and wavelengths of 532 nm and266 nm are available as options.
Equipment is also provided for focusing the laser and illuminating objects.
Examples of previous uses include streak camera sweep speed calibration,measurement of impulse response of a semiconductor radiation detector,
generation of a plasma X-ray source, and development of an X-ray opticalelement using that source.

■ Fee
Analysis by user

2,000 yen/hour

Analysis by staff

None■ Instrument location

Institute of Laser Engineering,
Plasma Research Lab, I213

16. Work Apparatus ①
High Resolution 3D PrinterStratasys Objet Eden 260(No. 88)■ Specifications/Features[Usable materials] Model materials: FullCure720, MED610, VeroBlue,
VeroGray, VeroWhite[Layer thickness] 16 µm (high-quality mode), 30 µm (high-speed mode)[Tray size] (X) 260 mm x (Y) 260 mm x (Z) 200 mm[Build size] (X) 255 mm x (Y) 252 mm x (Z) 200 mm[Build resolution](X) 600 dpi: 42 µm, (Y) 600 dpi: 42 µm,(Z) 1,600 dpi: 16 µm■ Fee
Analysis by user

1,000 yen/hour(free of charge for users within the course)

Analysis by staff■ Instrument location

None
Dentistry, C215

56｜Guide to Joint Use of Reuse Instruments

16. Work Apparatus ②
3D Shaping Systems (3D Scanner/3D Printer)
Solutionix Stratasys Rexcan ⅢDimension BST 3D Printer/Catalyst Vere.4.2(No. 65)■ Specifications/Features(Scanner)
This is a non-contact 3D scanner equipped with twin high-resolution CCD
cameras. The system is simple to operate and enables high-speed acquisition of
3D data of the scanned object. A multi-stripe pattern is projected onto thescanned object using the projector at the center of the scanner, and the distortionof the projected pattern is imaged using the two CCD cameras. 3D point clouddata is then acquired based on the principle of triangulation. Automatic
measurement can be performed using a turntable. CAD data can be created foritems with complex forms, objects of high rarity, and other similar items. Data
can be saved in SNX format, and output in STL/IEX/OBJ formats.
Measurement range (X, Y and Z axis): Min. 52.8 × 39.6 × 20 mm to Max. 648
× 486 × 460 mm
Resolution: 1.4 million pixels(Modeling system)
This enables fabrication of 3D-shaped structures through extrusion and layeringof ABS resin based on 3D CAD data (STL files). Maximum shaping size: 203 ×
203 × 305 mm■ Fee
Analysis by user

3D printer charge: (A+B+C) × 1.2
A. Modeling material cartridge rate:
Modeling material cartridge (920 cm3, 75,000 yen) × cartridge use ratio (%)
B. Support material cartridge rate:
Modeling material cartridge (920 cm3, 75,000 yen) × cartridge use ratio (%)
C. ABS plate (foundation) use rate:(Use of only the 3D scanner is free of charge)

Analysis by staff■ Instrument location

None
Engineering, 21st Century Plaza 4F,
Creative Engineering Center

57｜Guide to Joint Use of Reuse Instruments

16. Work Apparatus ③
NC Fine Machine
PMT Micro MC-3(No. 91)■ Specifications/Features
This automatic lathe turning machine enables cutting of 3D forms at micron size
using data prepared with the CAD software (GoElan).
Movement range: X-axis 150 mm, Y-axis 150 mm, Z-axis 100 mm
Positioning precision: ±5 µm
Repeatability: ±3 µm
Main shaft rotation speed: 2,000-40,000 rpm
Table dimensions: X direction 250 mm, Y direction 200 mm
Machinable material types: Metal, plastic, ceramics, etc.
Maximum width: Approx. 10 x 10 cm, Thickness: Approx. 4 cm

■ Fee
Analysis by user

1,000 yen/hour

Analysis by staff

None■ Instrument location

Office for University-Industry Collaboration,
A Building, Shared Equipment Room (A-004)

58｜Guide to Joint Use of Reuse Instruments

17. Computer ①
CLUSTER COMPUTER SYSTEM
DELL

HPC-ProServer(No. 112)
■ Specifications/Features
Cluster computing system consisting mainly of Dell PowerEdge R620
and PowerEdge R5500.

Total number of nodes 103
Total number of cores 1120

Peak performances
Clock speed 3.34 THz
Flops
Single precision 24.196 Tera Flops
Double precision 48.391 Tera Flops

Main memories 4.523 TBytes

Disk spaces:
Work space 115 TB
User’s home 290 TB
Database 142 TB
Backup 170 TB

Network link speed 10 G SFP+ x 2 (dual)■ Fee
Analysis by user

CPU charge:14 yen/hour
However, Immunology Frontier Research Center persons :8 yen/hour

File charge: 20 yen/ month(10GB)
However, Immunology Frontier Research Center persons :15 yen/month(10GB)
Analysis by staff■ Instrument location

None
Immunology Frontier Research Center 403

59｜Guide to Joint Use of Reuse Instruments

18. Other ①
Adiabatic Demagnetization Refrigerator System
Cambridge Magnetic Refrigeration MF-ADR50/3T(No. 27)■ Specifications/Features
Enables production of magnetic fields up to 3 T, and cryogenic temperatures up
to 50 mK.
With the mFridge, temperature control is performed by directly controlling themagnetic field, without using a heater.

■ Fee
Analysis by user

500 yen/hour

Analysis by staff

None■ Instrument location

Graduate School of Engineering Science, Center for Science andTechnology under Extreme Conditions, 1st Floor(Low Temperature Room,High-Magnetic-Field facility)

Charged Particle Measuring Device
Sumitomo Heavy Industries(No. 24)■ Specifications/Features
This system analyzes the energy of charged particles accelerated by an AVF
cyclotron accelerator, and provides transport to various types of experimental
instruments at a later stage.
The maximum analyzable proton energy is 80 MeV, and the maximum energy ofother ions is 30 MeV per nucleon. Momentum resolution is a maximum of
1/10,000.
This system is used together with the AVF cyclotron accelerator.

■ Fee
Analysis by user

None

Analysis by staff

Contact staff for details regarding fees.

■ Instrument location

Research Center for Nuclear Physics,
AVF Cyclotron Beam Transportation Room

60｜Guide to Joint Use of Reuse Instruments

The Center for Scientific Instrument Renovationand Manufacturing Support, Osaka University
Conditions for Joint Use of Reuse Instruments
Issued: April 1, 2014

(Purpose)
Article 1
As defined in Article 12 of the Regulations of the Center for Scientific Instrument
Renovation and Manufacturing Support (hereinafter, “the CRM”), these Conditions set
forth necessary matters on which students and staff members on campus can make
instruments registered in the reuse management system established by the CRM(hereinafter, “reuse instruments”).
(Registered Instruments)
Article 2
The instruments available for joint use across the different faculties on campus shallas specified in the appended table.
(User Qualification)
Article 3
Those who can use the reuse instruments (hereinafter, “users”) are as follows: (1) all
staff of the National University Corporation Osaka University (hereinafter, “ theUniversity”), (2) all students of the University.
(Persons in Charge of Reuse Instruments)
Article 4
To each reuse instrument the person in charge of the instrument shall be designatedamong the staff members of the faculty of the relevant reuse instrument by the head ofthat faculty.
(Procedure for Use)
Article 5
1 A person who wishes to use a reuse instrument shall obtain prior approval from theCRM director, by submitting an application for approval for joint use of reuse
instruments via the online application system.
2 In case of using the reuse instrument, the user must follow all directions from theperson in charge of the instrument.
3 When the user has finished/stopped using the reuse instrument, he or she should
notify the person in charge of the instrument of the operating conditions used andthe working conditions of the instrument during its use.
4 The user shall pay particular attention to prevent accidents and/or damage whenusing the reuse instrument. Please note that we shall assume no responsibility
whatsoever for any damages resulting or arising from, the use of the reuse
instrument by the user.
(Reuse Instrument Usage Fees)
Article 6
The CRM will charge usage fees and other necessary expenses to the user. All
instruments are available on a fee-per-use basis. The instrument usage fee for each
instrument shall be as stipulated in the separate documentation.
(Prohibition of Utilization Other Than for Intended Purposes)
Article 7
The user must not use the reuse instruments for any purposes other than the purposes
for which they are intended without approval for use by the CRM. Users must
furthermore not allow third parties to make use of the reuse instruments.
(Cancellation of Use Approval)
Article 8
In the event of the user’s failure to comply with the provisions or any other situation
where the CRM finds that there is a necessity of cancellation in view of the
management of the CRM, the director of the CRM may cancel the terms of approval
granted for use of the reuse instruments even should this be during the middle of use.
Even in this event, users are required to pay usage fees according to the completed
amount of use.

(User’s Obligations to Compensate Damages)
Article 9
1 In the case of any loss, damage or contamination to facilities and/or instruments
due to the user ’ s intention or gross negligence, which is attributable to the user,
such user shall restore at the user ’ s cost and expense, said damaged facilities
and/or instruments to their original state and/or compensate the relevant faculty
for any and all loss, damage and/or contamination.
2 Even due to unavoidable circumstances, the CRM is not responsible for any loss
and/or damages incurred to the user.
(Miscellaneous Provisions)
Article 10
In addition to the Conditions, any other matters necessary for joint use of the reuse
instrument shall be stipulated separately.
Supplementary Provisions
These Conditions shall come into effect from March 1, 2010.
We hereby revoke our former conditions “ Conditions for Joint Use of Reuse
issued on March 19, 2008 by the Renovation Center of Instruments for Science
Education and Technology, Osaka University.

Revisions coming into effect from April 1, 2010.
Revisions coming into effect from May 1, 2010.
Revisions coming into effect from July 1, 2010.
Revisions coming into effect from August 1, 2010.
Revisions coming into effect from September 1, 2010.
Revisions coming into effect from October 1, 2010.
Revisions coming into effect from January 1, 2011.
Revisions coming into effect from April 1, 2011.
Revisions coming into effect from May 25, 2011.
Revisions coming into effect from September 1, 2011.
Revisions coming into effect from December 1, 2011.
Revisions coming into effect from January 1, 2012.
Revisions coming into effect from February 1, 2012.
Revisions coming into effect from April 1, 2012.
Revisions coming into effect from July 1, 2012.
Revisions coming into effect from October 1, 2012.
Revisions coming into effect from November 1, 2012.
Revisions coming into effect from December 13, 2012.
Revisions coming into effect from March 1, 2013.
Revisions coming into effect from April 1, 2013.
Revisions coming into effect from April 15, 2013.
Revisions coming into effect from July 26, 2013.
Revisions coming into effect from November 1, 2013.
Revisions coming into effect from January 1, 2014.
Revisions coming into effect from January 17, 2014.
Revisions coming into effect from April 1, 2014.
Revisions coming into effect from June 1, 2014.
Revisions coming into effect from July 1, 2014.
Revisions coming into effect from October 1, 2014.
Revisions coming into effect from December 1, 2014.
Revisions coming into effect from January 1, 2015.
Revisions coming into effect from April 1, 2015.
Revisions coming into effect from April 20, 2015.
Revisions coming into effect from May 18, 2015.
Revisions coming into effect from July 1, 2015.
Revisions coming into effect from October 1, 2015.
Revisions coming into effect from December 1, 2015.
Revisions coming into effect from January 1, 2016.
Revisions coming into effect from February 1, 2016.
Revisions coming into effect from March 1, 2016.
Revisions coming into effect from April 1, 2016.
Revisions coming into effect from May 1, 2016.
Revisions coming into effect from June 1, 2016.
Revisions coming into effect from October 1, 2016.
Revisions coming into effect from November 1, 2016.
Revisions coming into effect from December 1, 2016.
Revisions coming into effect from January 1, 2017.
Revisions coming into effect from April 1, 2017.
Revisions coming into effect from May 1, 2017.

設 備 ・機 器

科学機器リノベーション・工作支援センターでは、科学機器リノベーション・工作支援センターは、本学所有の設備・機器の修理・バージョンアップ
本学所有の設備・機器の修理・バージョンアップを行い、を行い、学内での共同利用を推進しています。
学内での共同利用を推進しています。
大阪大学の学生・教職員の方に利用いただけ
大阪大学の学生・教職員の方に利用いただける
る分析機器・工作機械等についてご案内します。
分析機器・工作機器等についてご案内します。

大阪大学 科学機器リノベーション・工作支援センター
Center for Scientific Instrument Renovation and Manufacturing Support, Osaka University

大阪大学 科学機器リノベーション ・工作支援センター
Center for Scientific Instrument Renovation and Manufacturing Support,
Osaka University