実験報告書様式（一般利用課題・成果公開利用）

MLF Experimental Report

提出日 Date of Report
2017/2/13

課題番号 Project No.

装置責任者 Name of responsible person

2016A0106

Kenichi Oikawa

実験課題名 Title of experiment

装置名 Name of Instrument/（BL No.）

The trial of neutron diffraction imaging using a high-resolution

NOBORU (BL10)

WLSF-scintillator detector

実施日 Date of Experiment

実験責任者名 Name of principal investigator

2016/12/5-12/7

Takuro Kawasaki
所属 Affiliation
Japan Atomic Energy Agency
試料、実験方法、利用の結果得られた主なデータ、考察、結論等を、記述して下さい。（適宜、図表添付のこと）
Please report your samples, experimental method and results, discussion and conclusions. Please add figures andtables for better explanation.
1. 試料 Name of sample(s) and chemical formula, or compositions including physical form.
1.

NaCl single crystal, 7 mm x 8 mm x 10 mm

2.

β-Sn Single crystal, φ10 mm x L10 mm3.

Steel plate, t0.5 mm x 20 mm x 100 mm

2. 実験方法及び結果 （実験がうまくいかなかった場合、その理由を記述してください。）
Experimental method and results.

If you failed to conduct experiment as planned, please describe reasons.

[Method]
The sample stage and the high-resolution wavelength
shifting fiber scintillator detector were set up on thestage of NOBORU with the diffraction angle 2θ of90° as shown in Fig. 1. The distances between thebeam slit and the sample position was 425 mm, andbetween the sample position and the detector was 70mm. The difference of the sensitivity of each pixel
was corrected by the incoherent scattering intensityfrom a polyethylene block. The diffraction intensities
were recorded using a READOUT module and a VMECPU module as event data.

Fig. 1. Experimental set up1

2. 実験方法及び結果（つづき） Experimental method and results (continued)[Results]
a. β-Sn Single crystal
Fig. 2 (a) shows diffraction intensity map of 100 reflection from a part of the sample with the width of 1 mm.
The spatial resolution of this measurement is estimated to be about 200 μm from the beam divergence.
Bright parts and dark parts in the map indicate the distribution of sub grains in the sample.

The time-of-flight (TOF) diffraction profiles of three areas in the map are plotted in Fig. 2 (b). In the profile of the brightpart (area 3), only one peak, whose TOF is almost same as the peak of sum of the whole area (area 1), isfound. On the other hand, in the profile of the dark part (area 2), there are three peaks at TOF = 13400μs,13800μs and 14200μs. In addition to this, the intensity of these peaks is significantly smaller than theintensity of the peak of area 3. For that reason, in the dark part, there are small grains which have differentorientation.

Fig. 2. (a) Diffraction intensity map of 100 reflection from the part of β-Sn single crystal with the diameterof 10 mm. The gauge thickness was set to be 1 mm by the beam slit. (b) TOF profiles of 100 reflection
from the whole of the gauge, the bright part and the dark part of the map.
b. Steel plate
In general, the polycrystalline material which consists of small
particle gives homogeneous distributed diffraction intensity,
which is called Debye-Scherrer ring. However, if the particle
size is relatively

large, theinhomogeneous intensity

distribution can be observed. By using the high-resolution 2dimensional detector, the position of the particle with theparticular crystal orientation can be detected. In the present
measurement, the distribution of crystal grains which <100>orientation is normal to the plane in the steel plate with thelarge grain size of around 200 μm was visualized as shown in
Fig. 3. Because the resolution is not high enough, the size ofFig. 3. The positional distribution of thethe grains could not be evaluated.

<100> grains in the steel plate.
2