X-Card2 Series
0.4-128G 0.2-256G
0.8-64G 0.8-128G

The X-Card2 Series is an enhanced product family of liner array X-ray detector boards for Industrialand Security applications including Food and Pharmaceutical Inspection and Industrial Non-Destructive
Testing (NDT).
The X-Card2 provides improved imaging performace with lower dark image noise and increased dynamic range andsensitivity.

Features:
xx
x
xxxxx

Detectable X-ray energy range: 20KeV - 160KeV
Active length options for 51.2 mm and 102.5 mm
Pixel size options: 0.2 mm, 0.4 mm and 0.8 mm
Max readout rate: 1 MHz
Dynamic range: > 8000
Improved tolerance to electrostatic discharge (ESD): up to 2K Volts
contact discharge
Significantly improved radiation hardness
Eight gain options supported: 0.25pf - 3.5pf

All images © Detection Technology, and Fraunhofer EZRT

X-ray detector boards withintegrator/multiplexer ASIC

Benefits:
xxxx
xx

Suitable for diverse Industrial and Security applications including
Food, Pharmaceutical Inspection and Industrial Non-Destructive testing
Increased radiation hardness for longer detector lifespan and reduced
life time costs
Increased protection against ESD and moisture for ease of handlingIndustry leading image quality and speed with high performance DT
proprietary photodiode and ASIC designs
Increased sensitivity and reduced dark image noise for improved
image quality
Complete subsystems available, including detectors, controllers andsoftware libraries for rapid system development

Detection Technology, Inc. | Piisilta 1, 91100 Ii, FINLAND | Tel. +358 8 553 6600 | Fax +358 8 553 6611 | http://www.deetee.com | contact@deetee.com

DS0000075A

X-Card2 Series

General Characteristics

0.4-128G 0.2-256G
0.8-64G 0.8-128G
X-ray detector boards withintegrator/multiplexer ASIC

X-Card2
0.4-128G

X-Card2
0.2-256G

Detectable Energy Range
Scintillator

X-Card2
0.8-64G

X-Card2
0.8-128GNotes

20-160 keV

1)

GOS (Gd2O2S:Tb)

1)

0.5 mm2)

Scintillator Thickness
X-Card Length

51.3 +/- 0.05 mm

51.3 +/- 0.05 mm

51.3 +/- 0.05 mm

102.5 +/- 0.05 mm

X-Card Width

25 +/-0.1 mm

30 +/-0.1 mm

25 +/-0.1 mm

25 +/-0.1 mm

X-Card Thickness

1.6 +/- 0.1 mm

1.6 +/- 0.1 mm

1.6 +/- 0.1 mm

1.6 +/- 0.1 mm

Active area length

51.18 mm

51.18 mm

51.18 mm

102.36 mm

Number of Pixels

128

25664128

Pixel Pitch

0.4 mm

0.2 mm

0.8 mm

0.8 mmPixel Height

0.6 mm

0.3 mm

0.8 mm

0.8 mmPixel Width

0.32 mm0.15 mm0.72 mm0.72 mm

Minimun Integration Time

0.14 ms

0.28 ms

0.14 ms

0.14 ms

Maximum Integration Time

1 MHz

Dynamic Range (@1pf feedback
capacity and 3.5V reference voltage)> 8,000

Non-Linearity< 1%ESD Immunity> 2K volts

Operational Voltage+5 V DC

Radiation hardness

10 Mrads

Outline Dimensions

51.3 x 40 x 7.9 mm

51.3 x 29 x 5 mm

Note 4) Dynamic range is defined as thesaturation signal level divided by the RMS
noise in darkness with the default gain
setting (feedback capacitance 1 pf) of ASIC.
Available gain options are listed below:3)

4)

GS00

10

10

10

1

GS1

00

1

100

1

1

GS2

0000

1

1

1

1Gf
[pf]

0,25

3,532,52

1,5

10,5

Note 5) Life time with radiation is defined as
X-ray response drop reaches 50% incomparison to the original X-ray response.

5)

51.3 x 29 x 5 mm

Operational Temperature-5 - +60 ºC

Storage Temperature-10 - +70 ºC

Relative Humidity (Non-condensing)

Note 2) Phosphor layer thickness is 0.3 mm.
Note 3) The minimum integration time isdefined as Ckc is set to 4 MHz.

2s

Maximum read out rate

Note 1) CdWO4 is also available as
scintillator material. With CdWO4 thedetectable energy range can be suitable for100-600 keV or up to 9MeV.

102.5 x 29 x 5 mm

< 85 %Dynamic range comparison with gain selections
20 000

15 000

10 000

5 000

X-Card2
0,250,51,0

1,52,02,53,03,5X-Card

Feedback capacitance [pf]Detection Technology, Inc. | Piisilta 1, 91100 Ii, FINLAND | Tel. +358 8 553 6600 | Fax +358 8 553 6611 | http://www.deetee.com | contact@deetee.com