DR2021-03801

RELIABILITY TEST DATATEST ITEM :1) LOAD LIFE TEST
2) SHELF LIFE TEST
3) CHARACTERISTICS VS. TEMPERATURE

PRODUCTS :500 MXH 56 M EFC SN 22X25
500 MXH 470 M EFC SN 35X55

THE TEST RESULTRUBYCON CORPORATIONTEST SPEC.NO.
SIZE:Dia. 22 × 25 L
APPARATUS:

D.C. voltage and maximum rated ripple current (0.63Arms/120Hz)
shall be applied to capacitor at 105°C.
The D.C. voltage and peak A.C. voltage combined must not exceed
the rated voltage.

YHP MODEL 4274A LCR METER(at 120Hz)

NOTE: n = 6

DATA NO.

Capacitance Change[%]

LOAD LIFE TESTPROJECT:SAMPLE:
500 MXH 56 M EFC SN 22X25
TESTING METHODS:

1050-5-10-15-20-25-30-35-40

Spec.
After 2000 Hrs : ≦±20%

01000

2000

10Spec.
Initial: ≦0.25
After 2000 Hrs : ≦0.5

tanδ

10.1

0.01

Leakage Current/WV 5min
[μA]

01000

2000
Spec.
Initial: ≦501
After 2000 Hrs : ≦501

1000
100
10101000Time [Hours]

2000

THE TEST RESULTRUBYCON CORPORATIONPROJECT:SHELF LIFE TESTSAMPLE:
500 MXH 56 M EFC SN 22X25
TESTING METHODS:Dia. 22 × 25 L
SIZE:
APPARATUS:

Capacitors shall be stored at 105 ±2°C without loading for 1000 Hrs.

YHP MODEL 4274A LCR METER(at 120Hz)

Capacitance Change[%]

NOTE: n = 101050-5-10-15-20-25-30-35-40

Spec.
After test : ≦±20%

10Spec.
Initial: ≦0.25
After test : ≦0.5tanδ

10.1

Leakage Current/WV 5min[μA]

0.01

Spec.
Initial: ≦501
After test : ≦501

100010010Without Voltage Treatment

1Initial

After

CHARACTERISTICS VS. TEMPERATURE

RUBYCON CORPORATIONSAMPLE :Apparatus :Agilent Technologies - E4980A

500 MXH 56 M EFC SN 22X25
n=3( at 120Hz)
20710605-104
Impedance ratio Spec.
Z(-25)/Z(20) ≦ 10-20

3-30

2Impedance Ratio-40

1-500-40-20020406080

1001206080100120

Temperature [℃]

Dissipation Factor

10.00

1.00

0.10

0.01
-40

-20

020

40
Temperature [℃]

Impedance Ratio Z(t)/Z(20)Capacitance Change [%]Capacitance Change

THE TEST RESULTRUBYCON CORPORATIONTEST SPEC.NO.
SIZE:Dia. 35 × 55 L
APPARATUS:

D.C. voltage and maximum rated ripple current (2.19Arms/120Hz)
shall be applied to capacitor at 105°C.
The D.C. voltage and peak A.C. voltage combined must not exceed
the rated voltage.

YHP MODEL 4274A LCR METER(at 120Hz)

NOTE: n = 6

DATA NO.

Capacitance Change[%]

LOAD LIFE TESTPROJECT:SAMPLE:
500 MXH 470 M EFC SN 35X55
TESTING METHODS:

1050-5-10-15-20-25-30-35-40

Spec.
After 2000 Hrs : ≦±20%

01000

2000

10Spec.
Initial: ≦0.25
After 2000 Hrs : ≦0.5tanδ

10.10.01

Leakage Current/WV 5min
[μA]

01000

2000Spec.
Initial: ≦1454
After 2000 Hrs : ≦1454

1000
10010101000
Time [Hours]

2000

THE TEST RESULTRUBYCON CORPORATIONPROJECT:SHELF LIFE TESTSAMPLE:
500 MXH 470 M EFC SN 35X55
TESTING METHODS:

Dia. 35 × 55 L
SIZE:
APPARATUS:

Capacitors shall be stored at 105 ±2°C without loading for 1000 Hrs.

YHP MODEL 4274A LCR METER(at 120Hz)

Capacitance Change[%]

NOTE: n = 101050-5-10-15-20-25-30-35-40

Spec.
After test : ≦±20%

10Spec.
Initial: ≦0.25
After test : ≦0.5tanδ

10.1

Leakage Current/WV 5min
[μA]

0.01

Spec.
Initial: ≦1454
After test : ≦1454

1000
10010Without Voltage Treatment

1Initial

After

CHARACTERISTICS VS. TEMPERATURE

RUBYCON CORPORATIONSAMPLE :Apparatus :Agilent Technologies - E4980A

500 MXH 470 M EFC SN 35X55
n=3( at 120Hz)
20710

605-104
Impedance ratio Spec.
Z(-25)/Z(20) ≦ 10-20

3-30

2Impedance Ratio-40

1-500-40-20

020406080

1001206080

100120Temperature [℃]

Dissipation Factor

10.00

1.00

0.100.01-40-20

02040
Temperature [℃]

Impedance Ratio Z(t)/Z(20)Capacitance Change [%]Capacitance Change