LIV in the fast lane!

Laser Diode Test System LIV100Highlights:
High throughput
CompactLow cost

Our offer in Detail:
The LIV100 is a powerful test system for use in the lab as well as for OEM applications, ideal for•••

Diode characterization at the chip or bar level
Quality control of incoming goods
OEMWe offer this instrument with a variety of end stages covering current ranges from 1A up to 400A.
A complete parameter set for a given measurement protocoll may be uploaded to the LIV100. The LIV100 thentakes over the measurement procedure beginning with a test of proper laser contact. Once this preliminary test ispassed, the unit drives the laser with the given
prescription and performs the data acquisitionand storage. Many laser diodes of the same
type may now be tested in this manner withvery high throughput. The measurement cycle
takes less than 0.3s for 200 current steps1
including the data tranfer to the host computer.

Specifications• Current: up to 400A
• Rise time: <50ns2• Throughput: 0.3s per diode1• USB-controlled via command list
• Up to 6 channels of synchronized data acquisition• Optical spectrum: resolution ~0.1nm

Your problem is our challenge – flexibility is our standard:

LIV100_120602_Engl.doc

We will gladly adapt, for example, the wavelength or the current to suit your application.
Let us know your requirements.
Artifex Engineering e.K.
Dortmunder Str. 16-18
26723 Emden, Germany

General Manager: Dr. Steven Wright
Registry number: HRA 200036

Tel: +49-(0)4921-58908-0
eMail: info@afx-eng.com
Web: http://www.afx-eng.com/

Ordering Information
Long pulse version: LIV100-Lc-S

Fast rise time version: LIV100-Fc-S

max. current (c)max. current (c)3Appendix S for integrated spectrometer option .
Please contact us for customized units.

Specifications
PARAMETERCONDITIONSRESOLUTIONMINTYP

2 x Transimpedance amplifier (1 x reserved for power input, 1 x free e.g. for monitor diode)4 x A/D converter (2x reserved for current and voltage inputs, 2 x free for further signals)
selectable: 20/n MS/s
Sampling raten.a.
1
mit n = 1 .. 20

MAXUNITS

20MS/sINPUTS:A/D resolution

11bit

Photodiode gain

optimum gain
automatically selected

110100

V/mA

Input capacitance<20pF, gain = 1 kΩ50

ns

Transimpedance amplifier rise time

4OUTPUT
Pulse duration
Rise time

20MS/s sampling rate
1MS/s sampling rate
Fast rise time version
Long pulse version

0.050
10.1501Current overshoot5at maximum current
Pulse separation

Current range

selectable: 50•n µs
with n = 2 .. 10 000
LIV100-L002 (or F002)
LIV100-L040 (or F040)
LIV100-L080 (or F080)
LIV100-L120 (or F120)
LIV100-L200

Duty cycle

15%µsns50

100

500 000µs

0.0005
0.01
0.02
0.03
0.05

0.00050.01
0.020.030.0524080120200

A

D/A resolution
Compliance voltage

50420

100
2000
70
500

12bit
6

Fast rise time version
Long pulse version
Fast rise time version
LIV100-F002
LIV100-F040
LIV100-F080
LIV100-F120
Long pulse version
LIV100-L002
LIV100-L040
LIV100-L080
LIV100-L120
LIV100-L200

821V

25
1.5
0.7
0.5
%
356321.2

SIGNAL PROCESSING
Depth of storage

512

Number of channels

2

Number of cycles for averaging

13

1kB
6250

PC INTERFACE
TypeUSB; 100kB/s

114 x 150 x 125 mm (W x L x H)

mm

DIMENSIONSDAQ unit1At 2µs pulse width, 200 current steps and 0,2% duty cycle.
At 60A using F-version. Maximum current for F-verions is 120A.
3
Wavelength range and resolution per customer’s requirements.
4Per ANSI/IEEE Standard 181-1977: 10% - 90%.
5With optimized strip line connector.
6
Dependant on the configuration of the connecting cable.
2