X-Scan iHE2 Series

The X-Scan iHE2 Series is an enhanced product familyof high-resolution linear array detectors for high-energygy
X-ray Industrial Inspection applications utilizing X-ray energies
of up to 15MeV.
Increased radiation hardness increases the lifespan of the detector, reducing thttheelifetime cost of the system. Industry-leading image quality
ality with reduced dark image
imnoise and increased dynamic range and sensitivity.
Available with 0.2mm, 0.4mm and 0.8mm pixel pitches
es and in several standard lengths. Upon
request may be customized to different lenghts as wellll as for high-e
high-energy
energy tomography appapplications
plications
utilizing Linear Accelerators as the radiation source.

Features:xxxxxxxx

Benefits:

X-ray source energy range: 50 kVp - 600 kVp
Active length: from 410 mm to 820 mm
Pixel size options: 0.2 mm and 0.4 mm
Integration time: 0.8 ms at minimum
16-bit AD, Dynamic range: > 16000
Significantly improved radiation hardness
Support Ethernet interface
Pixelated Cadmium Tungstate (CdWO4) scintillatorxxxxxxx

High conversion efficiency, dynamic range and sensitivity for demanding
high energy applications
Increased radiation hardness for longer detector lifespan and reduced
lifetime costs
Cost efficient solution for industrial CT application
Applicable for both continuous and non-continuous X-ray sources
Customized solutions available upon request
Ethernet and frame grabber interfaces to meet a wide range of compatibility and performance requirements
Rapid evaluation and software development with included X-View demo
software, control library and sample source code

All images © Detection Technology, Fraunhofer EZRT and Fraunhofer EZRT in cooperation with AUDI AG

X-ray linear array detector

Enclosures of the X-Scan iHE2 Series
Enclosure Model

Active Length

LengthWidth

HeightMax Weight

X-Scan 0.xiHE2-410

410 mm (16.1”)

450 mm (17.7”)

160 mm (6.3”)

50 mm (2”)

6 kg (13 lbs)

X-Scan 0.xiHE2-512

512 mm (20.2”)552 mm (21.7”)

160 mm (6.3”)

50 mm (2”)

10 kg (22 lbs)

X-Scan 0.xiHE2-614

614 mm (24.2”)655 mm (25.8”)

160 mm (6.3”)

50 mm (2”)

12 kg (26 lbs)

X-Scan 0.xiHE2-820

820 mm (32.3”)

860 mm (33.9”)160 mm (6.3”)

50 mm (2”)

15 kg (33 lbs)

X-Scan 0.xiHE2-922

922 mm (36.3”)

962 mm (37.9”)

160 mm (6.3”)

50 mm (2”)

16 kg (35 lbs)

Detection Technology, Inc. | Piisilta 1, 91100 Ii, FINLAND | Tel. +358 8 553 6600 | Fax +358 8 553 6611 | http://www.deetee.com | contact@deetee.com

DS0000074A

X-Scan iHE2 Series

X-scan iHE2 Absorption Efficiencies

General Characteristics
General Charateristics

X-Scan0.2iHE2

X-ray Voltage Vp Range

X-Scan0.4iHE2

X-Scan0.8iHE2X-Scan
0.4iHE2-M

100-800 kVp

Scintillator Material

X-Scan0.8iHE2-M

Notes

10090

100-15 MeV

80

Pixelated CdWO4703.15 mm

Active Area Lengths

10 mm60410-820 mm1)

Pixel Pitch (spacing)

0.2 mm

0.4 mm

0.8 mm

0.4 mm

0.8 mmPixel Height (PD)

0.8 mm

0.6 mm

0.8 mm

0.6 mm

0.8 mmPixel Width (PD)

0.15 mm0.32 mm

0.7 mm0.32 mm

0.7 mm50402)CdWO4 3mm
3020

Pixel Height (scintillator)
Pixel Width (scintillator)

101.57 mm

00.1 mm0.25 mm0.65 mm0.25 mm0.65 mm

Maximum Scanning Speed

5-10 cm/s

20-26.7cm/s

53.6 cm/s

20-26.7cm/s

53.6 cm/s

Minimum Integration Times

2.0-4.0 ms

1.5-2.0 ms

1.5 ms

1.5-2.0 ms

1.5 ms100
Energy [keV]

1000

Continuous Mode

Maximum Integration Times

Note 1) Different active lengths may also be available uponrequest.
Note 2) Pixel pitch of 1.5mm, 1.6mm and 2.5mm may beavailable upon request.

128 msNon-continuous Mode
Integration Time Range
Maximum Scanning Time

20 cm7s - 32 cm/s

(depending on integration time setting)

Maximum Integration Time~ 54000 ADC counts@16-bit

A/D Resolution

Overall Uniformity withoutoffset at detector level

Note 4) Dynamic Range is defined as Saturation signal/RMS
Noise, with lowest gain setting (feedback capacitance is 3.5pf)
of ASIC.

128 msSaturation level of raw data

Overall Uniformity
without offset at X-card level

Note 3) The electronic crosstalk of each channel is measured inASIC level.

200 us - 1024 us

Available gain options are listed below:

16 bits
<±20%

<±15%

<±25%

<±20%

Electronic Crosstalk of EachChannel≤0.5%3)

Dynamic Range>160004)

Data Digital Interface

16 bits5)

Ethernet (Control: TCP/IP, Image: UDP) or
Frame grabber (Control. RS232, Image: Rs422)

6)

<1%7)

Operational Voltage+12V DC8)

Power Consumption

60W max

InterfaceNon-linearity

Operational Temperature

0 - 40ºC

Relative Humidity

30 - 80%

Storage Temperature-10 - 50ºC

GS00

10

10

101

GS1

001

100

11

GS2

00001

111Cf [pf]

0.25

3.5

32.5

21.5

10.5

Note 5) Digital interface uses 16-bit per pixel, but user canselect actual output data to be 16,14,12,10 or 8 bits. The
default value is 16-bits.
Note 6) The limitation of total pixel number with Ethernet
interface is 3072.
Note 7) Non-Linearity is defined as max deviation from ideal
response line defined by zero offset and signals at 80% of
dynamic range.
Note 8) The Operational voltage to be supplied to module.
External power supply for 100-240 AC is provided with themodule.

Detection Technology, Inc. | Piisilta 1, 91100 Ii, FINLAND | Tel. +358 8 553 6600 | Fax +358 8 553 6611 | http://www.deetee.com | contact@deetee.com

Absorption [%]CdWO4 6mm

Scintillator Apsorption Length