• HIGH QUALITYIMAGING DISPLAYEDIN REAL TIME
• EASY TO OPERATE• SIMPLICITY AND
ELEGANCE BY DESIGN• FREE OPTICAL ACCESSFROM ABOVE• LABVIEW SOFTWAREAND CONTROLLER

Complete Package

After carefully reviewing the needs of our customers,
the Nanonics team of designers and scientists have put
together a package designed to meet the three criteriaof reliability, simplicity and affordability.
With the Academia™ AFM head, the customer receives
a complete package consisting of AFM controller, familiar
LabVIEW based software package, computer and binocular
optical microscope for viewing the sample during thescanning process.
To ensure complete customer satisfaction, Nanonics has a comprehensive
customer support policy. This starts with three days of on-site installation andtraining from one of our expert application scientists and continues throughout
the customer’s use of the system. Specialist advice and support relating to thespecific research being conducted with the system is also provided. Upgrades
to other Nanonics SPM packages are available to Academia™ users.
High Quality Imaging Displayed in Real TimeThe Academia™ succeeds in producing scanning images of the highest quality.
We achieve lower noise levels by minimizing the mechanical parts of the systemand simplifying the electronics of the controller. This raises the overall signal
to noise ratio, therefore enabling fainter signals to be built into the images.
It is the small dimensions of our scanner combined with our high signal
to noise ratio that allows us to produce high resolution images quickly
and repeatably.
Easy to Operate

Our years of customer interaction have taught us how to make a system user
friendly. With our familiar LabVIEW software, the customer will be able toproduce quality images immediately upon installation.

Easy tip exchange

4.5 x 4.5 micron
Polymer surface

Changing the scanning probe is quick and effortless with the Academia's fliptop scan head. The probe can be removed and a new one replaced with notools and no disturbance to the sample.

0.9 x 0.9 micron
DNA on mica

50 x 50 micron
TFT LCD Display

1 x 1 micron
30 nm diameter gold balls

5 x 5 micron
Composite polymer

A Nanonics SPM Solution
Simplicity and Elegance by Design

Quality, durability and ease of use are most often the result of elegantly simple design
solutions. Our experience, gained from years of AFM development and customer interaction,
has resulted in an AFM scan head assembly with fewer individual components than any
AFM system available today. This provides for a more robust system, moving AFM
instrumentation to a higher level of reliability and consistency, which is increasingly
demanded by today's AFM operator.
The Academia™ scan head has a unique open architecture and the most user friendly designof any research grade AFM system.
Free Optical Access from Above

As a direct consequence of Nanonics superior design, the Academia™ can be used as anadd-on AFM to a customer’s existing microscopy set-up.
The top down optical access, characteristic of the Academia™ system, allows the microscope
head to be seamlessly placed under the objective lens of any upright microscope, without
restricting any of the functionality of the microscope or objective.
LabVIEW Software and Controller

The Academia™ system is packaged with the Nanonics developed AFM controller andLabVIEW software, both designed for ease of use. Our customers want to be able to start
producing quality images as soon as the system is installed. This is precisely what they
can do with the familiar LabVIEW software format.
One of the main advantages of using a LabVIEW package is the ability to continue writing
additional modules according to the user’s specific requirements. This aspect of the Academia™
system provides the ultimate flexibility in system software.
Affordability

The key aspect to theAcademia™ system is a low
price tag attached to a highquality research grade AFM.
The Academia™ shows that
reliability and quality can beaffordable for today’s market.

The Academia™ SystemSystem Specifications
Modes of Operation
Atomic Force Microscopy

Contact, non-contact, intermittent-contact

Feedback Mechanism

Optical beam deflection

Scanning/Sample
Scan Range

70µm XY, 5µm Z (10µm XY upon request)

Step Size<1nm for 70µm scanner, < 0.1nm for 10µm scanner

Maximum Sample Size

15mm X 15mmProbes
AFM Probes

Any commercially available AFM probes including
cantilevered or pulled glass probes

Specialized Probes

Cantilevered probes for electrical or thermal
measurements, AFM controlled Nanopens forgas and liquid chemical delivery. Custom probes
available on request

OpticsViewing OpticsBinocular microscope with boom standController/Software
Controller

Nanonics AFM controller

SoftwareUser friendly LabVIEW based SPM software
including software linearization

Manhat Technology Park, Malcha
Jerusalem 91487, Israel
Tel: +972-2-6789573
Fax: +972-2-6480827
US Toll-free: 1-866-220-6828
www.nanonics.co.il
email: info@nanonics.co.il