AUTOMOTIVE CURRENT TRANSDUCER OPEN LOOP TECHNOLOGY
DHAB S/118

Introduction

Automotive applications

The DHAB family is best suited for DC, AC, or pulsed currents
measurement in high power and low voltage automotiveapplications. It features galvanic separation between theprimary circuit (high power) and the secondary circuit (electroniccircuit).
The DHAB family gives you a choice of having different
current measuring ranges in the same housing (from ±20 up to±900 A).

● Battery Pack MonitoringFeatures● Open Loop transducer using the Hall effect● Low voltage application● Unipolar +5 V DC power supply● Primary current measuring range up to ±30 A for channel 1and ±350 A for channel 2● Maximum RMS primary admissible current: defined bybusbar to have T° < +150 °C● Operating temperature range: −40 °C < T° < +125 °C● Output voltage: full ratio-metric (in sensitivity and offset).

Special feature● Dual channel transducer for wider measurement range andredundancy.

Advantages● Hybrid Vehicles● EV and Utility Vehicles.

Principle of DHAB Family
The open loop transducers uses a Hall effect integrated circuit.
The magnetic flux density B, contributing to the rise of the Hallvoltage, is generated by the primary current IP to be measured.
The current to be measured IP is supplied by a current source
i.e. battery or generator (Figure 1).
Within the linear region of the hysteresis cycle, B is proportionalto:
B (IP) = a × IP

The Hall voltage is thus expressed by:
UHall = (cHall / d) × IHall × a × IP
Except for IP, all terms of this equation are constant.
Therefore:
UHall = b × IPaconstantbconstantcHallHall coefficient

dthickness of the Hall plate

IHall

current across Hall plates● Good accuracy for high and low current range● Good linearity● Low thermal offset drift

The measurement signal UHall is amplified to supply the user
output voltage or current.

● Low thermal sensitivity drift● Hermetic package.

+ UCIPUout- UCPrimary Current IP0V

Insulated Output Voltage Uout

Fig. 1: Principle of the open loop transducer.
Page 1/8

97.B6.99.118.0
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LEM International SA
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1217 Meyrinwww.lem.com

DHAB S/118
UL 508: Ratings and assumptions of certification
File # E189713 Volume: 2 Section: 13Standards● CSA C22.2 NO. 14-10 INDUSTRIAL CONTROL EQUIPMENT - Edition 11● UL 508 STANDARD FOR INDUSTRIAL CONTROL EQUIPMENT - Edition 17Ratings
Parameter

SymbolPrimary involved potential

UnitValue

V AC/DC300

Max surrounding air temperature

TA°C

100

Primary current

IPA

0 - 500

Transducer supply

UCV DC5Output voltageUoutV DC

0 to 5Conditions of acceptability
When installed in the end-use equipment, consideration shall be given to the following:
1 - These products must be mounted in a suitable end-use enclosure
2 - The secondary circuit pin terminals have not been evaluated for field wiring
3 - Low voltage control circuit shall be supplied by an isolating source of supply
4 - These products shall be used in a pollution degree 2 environments or better
5 - Primary feeder of the devices shall be connected after an overvoltage device or system which has been evaluated by theStandard for Transient Voltage Surge Suppressors, UL 1449 with a maximum clamping voltage of 4 kV.
Marking
Only those products bearing the UL or UR Mark should be considered to be Listed or Recognized and covered under UL’s
Follow-Up Service. Always look for the Mark on the product.

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DHAB S/118
Dimensions (in mm)

IP

Mechanical characteristics

System architecture (example)● Plastic case

>PBT-GF30<● Magnetic core		Channel 1: FeNi alloy
Channel 2: FeSi alloy● Electrical terminal coating Brass tin plated● Mass		82 g

● Degrees of protection provided by enclosure: IP6K9K

LEM - DHAB transducer+5V

Typical application +5 V
Schematic interface.

47 nF

100 nF

Gnd

Gnd

IP M
Primarycurrent

Channel 1

CL68 nF
Gnd

Mounting recommendation

R

TYCO 1-1456426-5

Gnd

Gnd Gnd● Max assembly torque

2.5 N·m (for M4 × 0.7 mm)● Clamping force must be applied on the compression limiter
N/ACL

68 nF

Gnd
Gnd

CRLChannel 2● Mating connector P/N● Soldering typeUC

RRL

Gnd Gnd

CGnd

RL > 10 kΩ optional resistor for signal line diagnostic
CL < 100 nF EMC protection
RC Low pass filter EMC protection (optional)

Remark● Uout > UO when IP flows in the positive direction (see arrowon drawing).

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DHAB S/118

Absolute ratings (not operating)ParameterSymbolUnitMinSpecification
TypicalConditions

Max

Maximum supply voltage

UC maxV−1414Ambient storage temperature

TA st°C−40

125

Electrostatic discharge voltage

UESDkV

8IEC 61000-4-2 - ISO 10605

RMS voltage for AC insulation test, 50 Hz, 1 min

UdkV

2.5

ISO 16750-2

Creepage distancedCpmm

ClearancedCImm

Comparative tracking index

CTI

3.1
3.1
PLC3

Maximum output current

Iout max

mA−1010Continuous

Maximum output voltage (Analog)

Uout max

V−1414Output over voltage,1 min @TA= 25 °C

Insulation resistance

RINSMΩ500Output short circuit maximum durationtcs

500 V DC, ISO 16750-2120

Operating characteristics in nominal range (IP N)
Parameter

SymbolSpecification
Min
TypicalElectrical DataUnit

Supply voltage 1)

UCVCurrent consumption

ICmA

Iout maxmA−1

Load resistance

RLΚΩ

10

Capacitive loading

CLnF

Maximum output current

Ambient operating temperature°C

TA

4.75

Conditions

Max

5

5.25

1520
1

1

100

−1065

High accuracy−40125

Reduced accuracy

Performance Data channel 1

Primary current, measuring range

IP M channel 1

A−30

Primary nominal DC or RMS current

IP N channel 1

A−30

Offset voltage

UOV

2.5

@ UC = 5 VSensitivity

SmV/A

66.7

@ UC = 5 VResolutionmV

2.5

Output clamping voltage min 1)

V

0.2

0.25

0.3

@ UC = 5 VV

4.7

4.75

4.8

@ UC = 5 V

10Output clamping voltage max 1)

US Z

30

Output internal resistance

Rout

Ω

1

Frequency bandwidth 2)

BWkHz

1.1

Power up time30

ms

@ UC = 5 V@ −3 dB
1

Setting time after overload

tsms

Ratiometricity error

εr%

−0.6

0.6mV−1010

Output voltage noise peak-peak

Uno pp@ TA = 25 °C

10Performance Data channel 2
Primary current, measuring range

IP M channel 2A−350

Primary nominal DC or RMS current

IP N channel 2

A−350

Offset voltage

UOV

2.5

@ UC = 5 V

Sensitivity

SmV/A

5.7

@ UC = 5 V

Resolution

mV

2.5

Output clamping voltage min 1)

V

0.2

0.25

0.3

@ UC = 5 V

V

4.7

4.75

4.8

@ UC = 5 V

10Output clamping voltage max 1)

US Z

350
350

Output internal resistanceRoutΩ1Frequency bandwidth 2)

BWkHz

1.1

Power up timems@ UC = 5 V@ −3 dB
1

Setting time after overloadtsmsRatiometricity error

εr%

−0.6

0.6

Uno ppmV−1010Output voltage noise peak-peakNotes:1)@ TA = 25 °C

10The output voltage Uout is fully ratiometric. The offset and sensitivity are dependent on the supply voltage UC relative to the following formula: 5
 1
IP = × U out − U O  × with S in (V/A)
 UC
 S2)		

Primary current frequencies must be limited in order to avoid excessive heating of the busbar, magnetic core and the ASIC (see feature paragraph inpage 1.)
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DHAB S/118
Error
Channel 1
Parameter

SymbolElectrical offset current

IO E

Magnetic offset current

IO M

Offset current

Min
Electrical Data
AεS

Linearity error@TA = 25 °C−0.150.15@TA = 25 °C

−0.23

0.23

@ −10 °C < T° < 65 °C−0.350.35@ −40 °C < T° < 125 °C%%

εL@TA = 25 °C±0.03

AConditions

Max±0.07

A

IO

Sensitivity error

Specification
TypicalUnit±0.4@ TA = 25 °C±1.0@ −10 °C < T° < 65 °C±1.5@ −40 °C < T° < 125 °C±0.5@ TA = 25 °C, @ UC = 5 V, of full
range

Error table
Parameter

SymbolUnit

Error @ 0 A
Error @ ±20 A

εAError @ ±30 A

Temperature−40 °C−20 °C

0 °C

25 °C

65 °C

125 °C

0.35

0.29

0.23

0.15

0.23

0.35

0.73

0.64

0.56

0.45

0.56

0.73

1.00

0.91

0.820.70

0.82

1.00

120

140

DHAB S/118 Channel 1: Absolute Error ε (A)2.00

Absolute error (A)

1.80
1.60
1.40
1.20
1.00
0.80
0.60
0.40
0.20
0.00

-40

-20

020406080100

Temperature (°C)
Error @ 0 A

Error @ ±20 A

Error @ ±30 A

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DHAB S/118Error
Channel 2Parameter

SymbolMin
Electrical Data

Electrical offset currentIO EAMagnetic offset current

IO M

AOffset current

εSLinearity error@ TA= 25 °C±0.25@ TA= 25 °C−11−1.2

1.2

−1.5

1.5%%

εLConditions

Max±0.6A

IO

Sensitivity error

Specification
TypicalUnit@ TA= 25 °C@ −10 °C < T° < 65 °C@ −40 °C < T° < 125 °C±0.4@ TA = 25 °C±0.8@ −10 °C < T° < 65 °C±1.2@ −40 °C < T° < 125 °C±0.5@ TA = 25 °C, @ UC = 5 V, of fullrange

Error table
Parameter

SymbolUnitError @ 0 A
Error @ ±175 A

εAError @ ±350 A

Temperature−40 °C−20 °C

0 °C25 °C

65 °C

125 °C

1.50

1.35

1.19

1.00

1.20

1.50

5.25

4.71

4.17

3.50

4.20

5.25

9.25

7.94

6.63

5.00

6.70

9.25

DHAB S/118 Channel 2: Absolute Error ε (A)10.00

Absolute error (A)

9.00
8.00
7.00
6.00
5.00
4.00
3.00
2.00
1.00
0.00

-40-20

020

4060

80

100120140

Temperature (°C)
Error @ 0 A

Error @ ±175 A

Error @ ±350 A

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DHAB S/118

PERFORMANCES PARAMETERS DEFINITIONSDelay time tD 90:

Primary current definition:

The time between the primary current signal (IP N) and theoutput signal reach at 90 % of its final value.

Uout

I [A]

Primary current nominal (IP N)
Primary current, measuring range (IP M)

IT90 %
Uout

IPtD 90

IPDefinition of typical, minimum and maximumvalues:
Minimum and maximum values for specified limiting and safety
conditions have to be understood as such as values shown in“typical” graphs. On the other hand, measured values are partof a statistical distribution that can be specified by an intervalwith upper and lower limits and a probability for measured
values to lie within this interval. Unless otherwise stated(e.g. “100 % tested”), the LEM definition for such intervals
designated with “min” and “max” is that the probability forvalues of samples to lie in this interval is 99.73 %. For a normal(Gaussian) distribution, this corresponds to an interval between−3 sigma and +3 sigma. If “typical” values are not obviouslymean or average values, those values are defined to delimit
intervals with a probability of 68.27 %, corresponding to aninterval between −sigma and +sigma for a normal distribution.
Typical, minimum and maximum values are determined during
the initial characterization of a product.

Output noise voltage:
The output voltage noise is the result of the noise floor of theHall elements and the linear amplifier.

Magnetic offset:
The magnetic offset is the consequence of an any current on
the primary side. It’s defined after a stated excursion of primarycurrent.

Linearity:
The maximum positive or negative discrepancy with a reference
straight line Uout = f (IP).
Unit: linearity (%) expressed with full scale of IP N.
Uoutt [µs]Sensitivity:
The transducer’s sensitivity S is the slope of the straight line
Uout = f (IP), it must establish the relation:
Uout (IP) = UC/5 (S × IP + UO)

Offset with temperature:
The error of the offset in the operating temperature is thevariation of the offset in the temperature considered with theinitial offset at 25 °C.
The offset variation IO T is a maximum variation the offset in thetemperature range:
IO T = IO E max − IO E min
The offset drift TCIO E AV is the IO T value divided by thetemperature range.

Sensitivity with temperature:
The error of the sensitivity in the operating temperature is therelative variation of sensitivity with the temperature consideredwith the initial offset at 25 °C.
The average temperature coefficient of sensitivity TCSAV, ST isthe maximum temperature variation of S (in ppm or %) of thesensitivity in the temperature range:
ST = (Sensitivity max − Sensitivity min) / Sensitivity at 25 °C.
The average temperature coefficient of sensitivity TCSAV is theST value divided by the temperature range.
Deeper and detailed info available is our LEM technical sales
offices (www.lem.com).

Non linearity example

Offset voltage @ IP = 0 A:
Referencestraight line
Max linearity error

IP
Linearity variation in IP N

The offset voltage is the output voltage when the primary current
is zero. The ideal value of UO is UC/2. So, the difference ofUO − UC/2 is called the total offset voltage error. This offset error
can be attributed to the electrical offset (due to the resolution of
the ASIC quiescent voltage trimming), the magnetic offset, thethermal drift and the thermal hysteresis. Deeper and detailed
info available is our LEM technical sales offices (www.lem.
com).

Environmental test specifications:
Refer to LEM GROUP test plan laboratory CO.11.11.515.0 with
“Tracking_Test Plan_Auto” sheet.
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DHAB S/118
Environmental test specifications:
NameStandardConditions

Low temperature storage test

ISO 16750-4
IEC 60068-2-1

Low temperature operation test

ISO 16750-4
IEC 60068-2-1 Ad−40 °C, 240 h; power ON

HTOE (high temperature operating endurance test)

ISO 16750-4
IEC 60068-2-2 Bd

1000 h; power supply @ 125 °C

Powered thermal cycle endurance

IEC 60068-2-14 Nb−40 °C (20 min), +125 °C (20 min), 600 cycles; offset
monitored

Thermal shock

IEC 60068-2-14 Na−40 °C (20 min soak) / 125 °C (20 min soak), 1000 cycles,with connectors => 667 h (28 days)

High temperature and humidity endurance

JESD22-A101

1000 h; 85 °C / 85 % HR; power ON; Monitored once a day

Salt fog

IEC 60068-2-11

96 h @ 35 °C, 5 % of salt water solution, characterization
before and after test only at 25 °C and UC nominal−40 °C, 240 h; no power supply

Mechanical tests
Vibration in temperature

ISO 16750-3 § 4.1.2.4
mass suspended

Continuous monitoring: offset

ShocksISO 16750-3§ 4.2

Power ON. Profile 1 (500 m·s-2; 11 ms) 10 shocks per axe Halfsinusoidal pulse

Free Fall test

ISO 16750-3

3 axis, 2 directions by axis;1 sample per axis; 1 m.; concretefloor

EMC test
BCI (bulk current injection)

ISO 11452-4
Annex E.1.1, Table E.1

From 1 to 400 MHz.
Level 1: 60 mA; Functional class: A
Level 2: 100 mA; Functional class: A
Level 4: 200 mA; Functional class: B

Radiated electromagnetic immunity

ISO 11452-2
GMW 3097 (04.2012)
table 12 p.21 (level 2)

Level: 100 V/m (RMS); from 400 M to 1 GHz
Functional class: A
Level: 70 V/m (RMS) from 1 G to 2 GHz Functional class: AEmission

CISPR 25

ESD not supplied

IEC 61000-4-2 +ISO 10605(07/2008)

Connector to connector engagement force

GMW 3191 § 4.11

Locked connector disengagement force

GMW 3191 § 4.13

Unlocked connector disengagement force

GMW 3191 § 4.14

Table 9, Class 5 by default
f = 150 kHz to 2.5 GHz
Contact discharge: ±4 kV & ±8 kV
Air discharge: ±15 kV
Functional class: A after reconnection(150 pF, 330 Ω)Connector tests

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