Pacifico Yokohama
Yokohama, Japan

18–21 April 2023

Optical Technology and Measurementfor Industrial Applications Conference

CONFERENCE CHAIRS(OPTM 2023)

Conference Co-Chairs: Yukitoshi Otani, Utsunomiya Univ. (Japan); Rainer Tutsch, Technische Univ.
Braunschweig (Germany); Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan)
Program Committee: Masato Aketagawa, Nagaoka Univ. of Technology (Japan); Yasuhiko Arai, Kansai Univ.
(Japan); Prathan Buranasiri, King Mongkut’s Institute of Technology Ladkrabang (Thailand);
Jürgen W. Czarske, TU Dresden (Germany); Motoharu Fujigaki, Univ. of Fukui (Japan); Amalia MartínezGarcía, Centro de Investigaciones en Óptica, A.C. (Mexico); Satoshi Gonda, National Institute of Advanced
Industrial Science and Technology (Japan); Sen Han, Univ. of Shanghai for Science and Technology(China); Feng-Lei Hong, Yokohama National Univ. (Japan); Nathan Hagen, Utsunomiya Univ. (Japan);
Hideki Ina, Canon Inc. (Japan); Ichiro Ishimaru, Kagawa Univ. (Japan); Lianhua Jin, Univ. of Yamanashi(Japan); Daesuk Kim, Chonbuk National Univ. (Korea, Republic of); Jonathan D. Kofman, Univ. of Waterloo(Canada); Kazuhide Kamiya, Toyama Prefectural Univ. (Japan); Qian Kemao, Nanyang TechnologicalUniv. (Singapore); Ryoichi Kuwano, Hiroshima Institute of Technology (Japan); Yu-Lung Lo, NationalCheng Kung Univ. (Taiwan); Yasuhiro Mizutani, Osaka Univ. (Japan); Christian Rembe, Technische Univ.
Clausthal (Germany); Pavel Pavlicek, Palacky Univ. Olomouc (Czech Republic); Takamasa Suzuki, Niigata
Univ. (Japan); Satoru Takahashi, The Univ. of Tokyo (Japan); Toshitaka Wakayama, Saitama Medical Univ.
(Japan); Wei-Chung Wang, National Tsing Hua Univ. (Taiwan); Gao Wei, Tohoku Univ. (Japan);
Jiangtao Xi, Univ. of Wollongong (Australia); Hayato Yoshioka, Tokyo Institute of Technology (Japan);Song Zhang, Purdue Univ. (United States)

Takeshi Hatsuzawa
Tokyo Institute ofTechnology (Japan)

Yukitoshi Otani
Utsunomiya Univ.
(Japan)Papers on the following and related topics are solicited for this conference:• 3D profilometry• polarimetry/ellipsometry• novel optical testing• surface inspection methods and applications• absolute testing for metrology• application of interferometric techniques• machine/robot vision methods, architectures andapplications• lighting methods and systems for inspection• dynamic measurement• unique optical systems for inspection andmeasurements• 2D and 3D machine vision methods andapplications• 3D data acquisition• freeform testing• scatterometry• unconventional microscope for inspection• super-high accurate measurement for smoothsurfaces• micro- and nano-scale measurement methods• structured light methods, fringe projection
measurement and applications• phase shifting methods applied to industrial
inspection• mechanic-optics and photonics for
metrologyand inspection• optical inspection by optical comb
• super resolution microscope for inspection• spherical and aspherical measurements• color metrology of manufactured goods• on-line and process control measurements• on-machine tool measurements of shape andfinish• high-resolution and high-speed inspection
applications• novel interferometry.

Submit your abstract today
https://opicon.jp/conferences/OPTM

Rainer Tutsch
Technische Univ.
Braunschweig (Germany)

Toru Yoshizawa
NPO 3D Associates(Japan)

Submission Deadline: 27 January 2023