Terahertz spectrum analyzer based on aterahertz frequency comb
Shuko Yokoyama1,2, Ryotaro Nakamura1, Masaki Nose1, Tsutomu Araki1,
and Takeshi Yasui1,*
1

Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
2
Micro-Optics Co. Ltd. , 2-26 Oe-Tsukahara, Nishikyoku, Kyoto, 610-1105, Japan*
Corresponding author: t-yasui@me.es.osaka-u.ac.jp

Abstract: Precision frequency measurements of terahertz (THz) waves are
required to establish metrology in the THz spectral region. However,frequency measurement techniques in this region are immature. We proposea THz spectrum analyzer to measure the absolute frequency and spectral
shape of continuous-wave THz waves. Based on a stable frequency comb
generated in a photoconductive antenna, the absolute frequency of a subTHz test source was determined at a precision of 2.8×10-11. Furthermore, thespectral bandwidth of the THz spectrum analyzer can be extended over 1
THz, as demonstrated by measurement of a THz test source. This spectrum
analyzer has the potential to become a powerful tool for THz frequency
metrology.
©2008 Optical Society of America
OCIS codes: (120.3930) Metrological instrumentation; (120.6200) Spectrometers andspectroscopic instrumentation; (300.6320) Spectroscopy, high-resolution; (300.6495)
Spectroscopy, teraherz.

References and links
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2.

D. M. Mittleman, Sensing with THz radiation (Springer, 2003).
F. Capasso, R. Paiella, R. Martini, R. Colombelli, C. Gmachl, T. L. Myers, M. S. Taubman, R. M. Williams,
C. G. Bethea, K. Unterrainer, H. Y. Hwang, D. L. Sivco, A. Y. Cho, A. M. Sergent, H. C. Liu, and E. A.
Whittaker, “Quantum cascade lasers: ultrahigh-speed operation, optical wireless communication, narrow
linewidth, and far-infrared emission,” IEEE J. Quantum Electron. 38, 511-532 (2002).
3. R. Köhler, A. Tredicucci, F. Beltram, H. E. Beere, E. H. Linfield, A. G. Davies, D. A. Ritchie, R. C. Iotti,
and F. Rossi, “Terahertz semiconductor-heterostructure laser,” Nature 417, 156-159 (2002).
4. H. Ito, T. Furuta, F. Nakajima, K. Yoshino, and T. Ishibashi, “Photonic generation of continuous THz wave
using uni-traveling-carrier photodiode,” IEEE J. Lightwave Technol. 23, 4016- 4021 (2005).
5. N. Orihashi, S. Suzuki, and M. Asada, “One THz harmonic oscillation of resonant tunneling diodes,” Appl.
Phys. Lett. 87, 233501 (2005).
6. P. Gaal, M. B. Raschke, K. Reimann, and M. Woerner, “Measuring optical frequencies in the 0–40 THz
range with non-synchronized electro–optic sampling,” Nat. Photonics 1, 577-580 (2007).
7. O. Morikawa, M. Tani, M. Fujita, and M. Hangyo, “Heterodyne receiver using a photoconductive antenna
and a continuous-wave laser diode in sub-THz region,” Jpn. J. Appl. Phys. 46, L951-L953 (2007).
8. Th. Udem, R. Holzwarth, and T. W. Hänsch, “Optical frequency metrology,” Nature 416, 233-237 (2002).
9. T. Yasui, Y. Kabetani, E. Saneyoshi, S. Yokoyama, and T. Araki, "Terahertz frequency comb by multifrequency-heterodyning photoconductive detection for high-accuracy, high-resolution terahertz
spectroscopy," Appl. Phys. Lett. 88, 241104 (2006).
10. B. H. Kolner and D. M. Bloom, “Electro-optic sampling in GaAs integrated circuits,” IEEE J. Quantum
Electron. QE-22, 79-93 (1986).
11. G. K. Gopalakrishnan, W. K. Burns, and C. H. Bulmer, “Microwave-optical mixing in LiNbO3 modulators,”
IEEE Trans. Microwave Theory Tech. 41, 2383-2391 (1993).
12. M. Ashida, R. Akai, H. Shimosato, I. Katayama, T. Itoh, K. Miyamoto, and H. Ito, “Ultrabroadband THz
field detection beyond 170THz with a photoconductive antenna,” in Conference on Lasers and ElectroOptics, Technical Digest (2008), CTuX6.
13. M. Tani, S. Matsuura, K. Sakai, Kiyomi, and S. Nakashima, “Emission characteristics of photoconductive
antennas based on low-temperature-grown GaAs and semi-insulating GaAs,” Appl. Opt. 36, 7853-7859(1997).

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Received 23 Jun 2008; revised 31 Jul 2008; accepted 5 Aug 2008; published 11 Aug 2008

18 August 2008 / Vol. 16, No. 17 / OPTICS EXPRESS 13052

1. Introduction
Frequency is a fundamental physical quantity of electromagnetic wave. Therefore, various
techniques have been established to measure the frequency of electromagnetic waves.
Interferometry is often used in the optical region. For precise measurements, the number ofinterference fringes of a measured monochromatic source is compared with that of a standard
signal having a known optical frequency (e.g., a frequency stabilized laser) over a given path
length. On the other hand, a heterodyne method is typically used at microwave and millimeter
wavelengths. In this method, a measured wave is detected with an antenna and thenelectrically mixed with a standard signal from a local oscillator of known frequency, resulting
in the generation of a heterodyne beat signal at radio frequencies (RF). The beat frequency
can be precisely measured with RF instruments.
In the past decade, terahertz (THz) radiation, lying at the boundary between optical andelectrical waves, has emerged as a new mode for sensing and communication. THz spectral
fingerprints are useful in various sensing applications [1]. In addition, THz waves are
expected to find application as a carrier wave for broadband wireless communications [2].
Following an increase of such THz applications, a need for THz frequency metrology hasarisen. Furthermore, the advent of practical continuous-wave THz (CW-THz) sources, such as
THz quantum cascade lasers [3], uni-traveling-carrier photodiodes [4], and resonant tunneling
diodes [5], have increased demand for precise frequency measurement of CW-THz waves.
However, it has proved difficult to cover the full range of THz radiation (typically, 0.1 to 10THz) because existing methods are not optimized for the THz region. Furthermore, existing
instruments often require cooling to suppress thermal noise. Recently, new techniques for thefrequency measurement of CW-THz waves have been proposed. A non-synchronized electrooptic sampling technique using a mode-locked Ti:sapphire laser has been applied to thefrequency measurement of a CW CO2 laser at 28 THz [6]. The frequency measurement of a
50-GHz CW wave from a Gunn oscillator was performed by combining use of aphotoconductive antenna (PCA) for a heterodyne receiver with the optical intermode beat of alaser diode for a local oscillator [7]. However, the signal-to-noise ratio is low in the former
method, and it is difficult to achieve precise measurements of the absolute frequency in either
method.
In the optical region, optical frequency combs have emerged as a new mode for frequency
metrology [8]. Since the frequency comb provides attractive features for frequency metrology,
namely excellent accuracy and stability, broadband selectivity, ultra-narrow linewidth, andexact multiplication, it can be used as a precise ruler in the frequency domain. Recently, we
have extended the concept of a frequency comb to the THz region using multi-frequencyheterodyning photoconductive detection [9]. Since this so-called THz comb is a harmonic
comb of the laser mode-locked frequency without any offset, it enables absolute frequency
measurements using the mode-locked frequency and order of the comb mode. Such a THz
comb is grouped into two modes: an electromagnetic THz comb (EM-THz comb) and aphotocarrier THz comb (PC-THz comb). When a PCA is used as a THz emitter by adding anelectrical bias between electrodes of the antenna, an EM-THz comb is radiated from the PCA
and propagates in free space. Conversely, when one uses a PCA connected to an ammeter as a
THz detector, a sequence of instantaneous photoconductive gates by the probe pulse light
induces a PC-THz comb in the PCA. It can then be used as a THz detector equipped with aruler for the absolute frequency because the PCA and the PC-THz comb respectively act as aheterodyne receiver and a local oscillator with multiple frequencies. Previously we measured
the detailed frequency spectrum of an EM-THz comb using a PCA having a PC-THz comb
[9]. This concept can be applied to frequency measurements of CW-THz waves. In this paper,
we propose a new spectrum analyzer to measure the absolute frequency and spectral shape of
CW-THz waves. We demonstrate its application to determine the absolute frequency of a
CW-THz wave radiated from a test source.

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Received 23 Jun 2008; revised 31 Jul 2008; accepted 5 Aug 2008; published 11 Aug 2008

18 August 2008 / Vol. 16, No. 17 / OPTICS EXPRESS 13053

2. Principle of operation
In the field of microwave technology, harmonic mixing technique based on electro-optic
sampling has been often used to down-convert microwave spectrum to RF spectrum using the
comb spectrum of the mode-locked laser with a nonlinear detection technique [10, 11]. We
here modified this technique to down-convert THz spectrum to RF spectrum using
photoconductive detection. Our THz spectrum analyzer is based on a heterodyne technique asshown in Fig. 1. Compared with the electrical heterodyne method, a key difference here is that
the PCA is used as both a detector and a mixer for the measured CW-THz wave. Use of a
PCA as a heterodyne receiver achieves high, broadband spectral sensitivity in the THz region
without the need for cooling. Another difference is the use of a PC-THz comb as a local
oscillator with multiple frequencies covering from the sub-THz to the THz region.

Fig. 1. Principle of THz spectrum analyzer.

Consider a PCA detector when an fs-ML laser light (probe pulse with mode-locked
frequency f) is incident on the antenna gap of a photoconductive film, as shown in Fig. 2(a).
Figure 2(b) illustrates the corresponding spectral behaviors in optical, THz, and RF regions.
The probe pulse train emitted from the fs-ML laser constructs an optical frequency comb inthe frequency domain, whose mode spacing is equal to a mode-locked frequency [upper partof Fig. 2(b)]. When the PCA is triggered by such pulse train, time-varying photo-createdcarriers are generated in the PCA due to the quadratic detection which squares the electricfield of the input light and then converts the optical intensity to electric carriers. Resultant
photo-created carriers function as a sequence of instantaneous photoconductive gating.
Defining N(t) as the number of photo-created carriers, the Fourier transform of N(t), N(ω),
also forms a comb structure, i.e., PC-THz comb [middle part of Fig. 2(b)]. Because thegeneration of the PC-THz comb can be considered as an ultra-wideband demodulation of an
optical frequency comb via the PCA, the optical comb (frequency spacing of f) is downconverted to the THz region without any change in its frequency spacing. The resulting PCTHz comb is a harmonic frequency comb without any offset, composed of a fundamental
component (of frequency f) and a series of harmonic components (at 2f, 3f, …, nf) of a modelocked frequency. This is the biggest difference compared to an optical frequency comb
having a carrier-envelope offset frequency, and it enables us to achieve simple, practical THz
frequency metrology including stabilization of a THz comb.
Next, consider what happens when a measured CW-THz wave [ETHz(t) in the time domain
or ETHz(ω) in the frequency domain] is incident on a PCA detector triggered by the probe
pulse train. The photo-created carriers, N(t), are accelerated by ETHz(t) and this acceleration ofN(t) is detected as a transient photocurrent, J(t). Thus, J(t) is proportional to the product ofN(t) and ETHz(t). This product relationship in the time domain leads to the convolution
relationship in frequency domain. Therefore, the Fourier transform of J(t), J(ω), from the
PCA is given as the convolution of the CW-THz wave ETHz(ω) and the PC-THz comb N(ω) as#97788 - $15.00 USD(C) 2008 OSA

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shown in lower part of Fig. 2(b), which is defined as photoconductive mixing. Such aphotoconductive mixing process in the PCA generates a group of beat signals between the
CW-THz wave and the PC-THz comb in the RF region. Focus on a beat signal at the lowest
frequency. Since the beat signal (of frequency fb) is generated by mixing the CW-THz wave(of frequency fx) with the m-th comb mode (of frequency mf) nearest in frequency to the CWTHz wave, the fb value is given as follows
fb = |fx - mf|.

(1)

Therefore, if the order of m and the sign of fx - mf are measured, the fx value can be
determined. In order to determine the order of m and the sign of fx - mf, the mode-locked
frequency is changed from f to f + δf by adjustment of the laser cavity length. This results in achange of the beat frequency to fb + δfb. Since |δfb| is equal to |mδf|, the order of m isdetermined as

m=

δf b
.
δf

(2)

The sign of δfb/δf equals inverse of that of fx - mf. Finally, the absolute frequency of themeasured CW-THz wave can be determined by measuring f, fb, δf, and δfb because
fx = mf + fb

(δfb/δf < 0)(3a)fx = mf - fb

(δfb/δf > 0).

(3b)

and

Fig. 2. (a). Geometry of a measured CW-THz wave and probe pulse light on the PCA, and (b)the corresponding spectral behavior in optical, THz, and RF regions.

3. Experimental setup
Figure 3 illustrates the setup of our THz spectrum analyzer. A Kerr-lens mode-locked
Ti:sapphire laser (FEMTOLASERS Femtosource Scientific Pro with pulse energy = 3.7 nJ,
pulse duration = 10 fs, central wavelength = 780 nm, and repetition rate = 81.8 MHz) was
employed as a probe laser to generate a PC-THz comb in a PCA. The mode-locked frequency
f was stabilized using a laser control system referred to a rubidium frequency standard(Stanford Research Systems FS725 with frequency = 10 MHz, accuracy = 5×10-11, stability =2×10-11 at 1 s) [9]. Because the frequency fluctuation between f and the rubidium frequency
standard corresponds to the instability of 2.7×10-14 (1 sec), the resultant instability andaccuracy of f were regarded as equivalent to those of the rubidium frequency standard. Such

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18 August 2008 / Vol. 16, No. 17 / OPTICS EXPRESS 13055

the accuracy and instability of f enable us to generate a PC-THz comb in the PCA equivalent
to the rubidium frequency standard.
A probe light (with an average power of 10 mW) from the stabilized Ti:Sapphire laser isfocused onto an antenna gap in a PCA using a lens, resulting in the generation of a PC-THz
comb. Although the PC-THz comb is generated consecutively from the RF to the THz region
without gap, the actual spectral sensitivity of the THz spectrum analyzer is limited by theantenna shape of the PCA and/or the phonon absorption in the PCA materials. We used two
kinds of the PCA: a bowtie-shaped, low-temperature-grown GaAs (LT-GaAs) PCA (bowtie
length = 1 mm and gap = 5 µm) having peak sensitivity around a few hundred GHz formeasurement of a sub-THz test source and a dipole-shaped, LT-GaAs PCA (length = 7.5 µm,
width = 10 µm, and gap = 5 µm) having high sensitivity over 1 THz for measurement of a
THz test source. A CW-THz wave from a test source is incident on the PCA through aspherical silicon lens from the opposite direction of the probe light, without any collimating or
focusing of the CW-THz beam. Photoconductive mixing between the CW-THz wave and the
PC-THz comb generates a current signal from the PCA. The output current is amplified by a
wideband video amplifier (bandwidth = 900 MHz and gain = 30 dB) or a high-gain current
preamplifier (bandwidth = 1 MHz and sensitivity = 4×106 V/A) and then measured with an RF
spectrum analyzer (Agilent E4402B with a frequency range of 100 Hz to 26.5 GHz) to
determine its frequency and spectral shape. The mode-locked frequency f is measured using
an RF frequency counter (Agilent 53132A with a frequency range to 225 MHz). The spectrum
analyzer and frequency counter are locked to the rubidium frequency standard used for thelaser stabilization control.

Fig. 3. Experimental setup of THz spectrum analyzer for measurement of a sub-THz test
source. fs-ML Ti:S laser: femtosecond mode-locked Ti:sapphire laser; PZT: piezoelectrictransducer; BS: beam splitter; L: objective lens; PCA: photoconductive antenna; Si-L: siliconlens; PD: photodetector; AMP: amplifier.

4. Results
4.1 Measurement of a sub-THz test source
To test the THz spectrum analyzer, an active frequency multiplier chain (Millitech AMC-10R0000 with multiplication factor = 6, output frequency = 75–110 GHz, and output power = 4
dBm = 2.5 mW) driven by a frequency synthesizer (Agilent E8257D with frequency = 12.5–
18.33 GHz, power = 10 dBm, and linewidth < 0.1 Hz) is used as a test source in the sub-THz
region. Since the frequency synthesizer is synchronized to the rubidium standard used forcontrol of the mode-locked frequency, any frequency fluctuations arising from the standard iscancelled as the common-mode fluctuations in this demonstration. The current signal from the
PCA passes through the wideband video amplifier and is then measured by the spectrum
analyzer. Figure 4(a) shows the resulting signal spectrum when the output frequency of thetest source and the laser mode-locked frequency are set at 90,008,480,000 Hz and 81,840,000#97788 - $15.00 USD(C) 2008 OSA

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18 August 2008 / Vol. 16, No. 17 / OPTICS EXPRESS 13056

Hz, respectively [sweep time = 100 ms and resolution bandwidth (RBW) = 300 kHz]. Manybeat signals between the CW-THz wave and the PC-THz comb were observed. Figure 4(b)shows an expansion of the spectral region from 0 to 100 MHz with a sweep time of 100 ms
and an RBW of 300 kHz. One sees a pair of beat signals at fb and f-fb. The fb signal at 23.6
MHz is a beat signal between the CW-THz wave and the m-th comb mode nearest in
frequency to the CW-THz wave, while the f-fb signal at 58.2 MHz is a beat signal between the
CW-THz wave and the (m+1)th or (m-1)th comb mode. To further expand the spectrum of the
fb signal, the beat frequency was set below 1 MHz by adjusting the output frequency of thetest source and the mode-locked frequency because the bandwidth of the employed high-gaincurrent preamplifier is 1MHz. Linear-scale and logarithmic-scale spectra of the fb beat signal
were then measured by the RF spectrum analyzer as shown in Figs. 4(c) and 4(d) with asweep time of 2.3 s and an RBW of 1 Hz. The resulting spectral linewidth was 1.35 Hz. On
the other hand, the signal-to-noise ratio (SNR) of the fb beat signal in Fig. 4(d) was 50 dB.
From this SNR and the output power of the test source (namely +4 dBm = 2.5 mW), thedetection limit of the THz power is estimated to -46 dBm (or 25 nW) for a sweep time of 2.3
sec.

Fig. 4. Spectra of the PCA current under irradiation of a CW-THz wave (freq. =90,008,480,000 Hz) with frequency span of (a) 1000 MHz and (b) 100 MHz. (c) Linear-scaleand (d) logarithmic-scale spectra of the fb beat signal when the fb value is set below 1 MHz.

To determine the absolute frequency of a test source, it is necessary to measure thedeviation of the beat frequency while tuning the mode-locked frequency. The initial modelocked frequency is set at 81,823,757.000 Hz and then the beat signal at the lowest frequency
is measured by combining the high-gain current preamplifier and the RF spectrum analyzer.
The resulting spectrum of the beat signal is plotted by the red curve in Fig. 5 (sweep time =773 ms and RBW = 1 kHz). The beat frequency at f = 81,823,757.000 Hz was determined to#97788 - $15.00 USD(C) 2008 OSA

Received 23 Jun 2008; revised 31 Jul 2008; accepted 5 Aug 2008; published 11 Aug 2008

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be 454,027.976 Hz by the spectrum analyzer. Next, the mode-locked frequency was increased
to 81,823,857.000 Hz by changing the reference frequency of the stabilized control of themode-locked frequency. This results in a deviation of the beat frequency indicated by the blue
curve in Fig. 5. The beat frequency then became 333,027.731 Hz. By substituting these values
into Eq. (2), one obtains

m=

δf b
333,027.731− 454,027.976== 1210.00245
δf
81,823,857.000 − 81,823,757.000

(4a)

and

δf b
< 0.
δf

(4b)

Therefore, the absolute frequency fx of the test source was determined using Eq. (3a) to befx = mf + fb = 1210 × 81,823,757 + 454,027.976 = 99,007,119,997.976 Hz.

(5)Since the actual frequency of the test source was 99,007,200,000.000 Hz, the error between
the set and measured frequencies was only 2.024 Hz.

Fig. 5. Spectra of the fb beat signal when the laser mode-locked frequency (f) is set at
81,823,757 (red curve) Hz and 81,823,857 Hz (blue curve).

Next, we determined the absolute frequency of the test source while tuning its output
frequency from 75 to 110 GHz at 5-GHz intervals. Table 1 summarizes the results of setting
fx, f, δf, fb, δfb, m, measured fx, error between setting and measured fx, and precision at each
output frequency. The positive frequency offset was measured as an error at each frequency.
These offset errors are likely due to systematic errors caused by the frequency synthesizer
and/or spectrum analyzer used in the present setup, due for example to insufficient frequency
calibration of the instruments. When the measurement precision of the THz spectrum analyzer
is defined as a ratio of the error to the set value, a mean precision of 2.8×10-11 was achieved inthis demonstration.

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Received 23 Jun 2008; revised 31 Jul 2008; accepted 5 Aug 2008; published 11 Aug 2008

18 August 2008 / Vol. 16, No. 17 / OPTICS EXPRESS 13058

Table 1. Results of absolute frequency measurement of the sub-THz test source when tuning its output frequency
from 75 to 110 GHz at 5-GHz intervals.

δf
(H
z)

m

Measured fx
(Hz)

Erro
r
(Hz)

91,700.34291
775,033,334,796.6
37

3.36
3

4.482×10

359,999.
487

97,800.830

97880,024,623,199.4
87

0.51
3

6.411×10

85,015,851,600

299,995.
634

103,898.97
4

1,0
39

85,015,851,595.6
34

4.36
6

5.136×10

90,007,140,000

299,997.
658

110,000.39
2

1,1
00

90,007,139,997.6
58

2.34
2

2.602×10

317,997.
685

116,099.85
3

1,1
61

94,998,446,397.6
85

2.31
5

2.437×10

99,989,728,800

311,997.
413

122,200.07
6

1,2
22

99,989,728,797.4
13

2.58
7

2.587×10

104,981,061,354

356,151.
511

128,300.53
8

1,2
83

104,981,061,351.
511

2.48
9

2.371×10

109,972,299,617

306,014.
217

134,399.21
7

1,3
44

109,972,299,614.
217

2.78
3

2.531×10

Mean

2.59
5

2.848×10-

Setting fx
(Hz)

δfb

fb
(Hz)

(Hz)

75,033,334,800

359,996.
637

80,024,623,200

94,998,446,400f(Hz)

81,824,400

100

Precisio
n
-11

-11

-11

-11

-11

-11

-11

-11

4.2 Measurement of a THz test source
The bandwidth of the THz spectrum analyzer should be limited by that of the PCA including
its antenna shape and phonon absorption. The spectral characteristics of the PCA as a THz
detector have been previously investigated using THz time-domain spectroscopy, for which a
bandwidth of 170 THz was achieved [12]. It is interesting to experimentally investigate theapplicability of our spectrum analyzer to frequencies above 1 THz. Unfortunately, few test
sources of CW waves are available in this frequency region. One source is the EM-THz comb
radiating from a PCA emitter triggered by a fs-ML laser. Because the EM-THz comb is agroup of many CW-THz waves having a frequency spacing equal to the laser mode-locked
frequency, it can be used as a test source with multiple frequencies ranging from sub-THz to afew THz.
The generation and detection of EM-THz combs is given in detail elsewhere [9].
Therefore, only a brief description of the method is given here. We prepared anotherstabilized fs-ML Ti:sapphire laser (FEMTOLASERS Femtosource Scientific Pro) for a pumplaser and a micro-structured, large-area GaAs PCA (GigaOptics Tera-SED 3) for generationof the EM-THz comb. In order to separate many beat signals generated between EM-THz
comb mode and PC-THz comb mode, the mode-locked frequency of the pump laser (f’ = f +Δf = 81,823,762 Hz) is slightly detuned from that of the probe laser (f = 81,823,757 Hz) by an
offset of Δf = 5 Hz. The EM-THz comb having a frequency spacing of f’ propagated in freespace through pairs of spherical silicon lenses and off-axis parabolic mirrors, and was thenfocused onto a dipole-shaped LT-GaAs PCA for the THz spectrum analyzer, to improve thecoupling efficiency of the EM-THz comb to the PCA. The resulting spectrum is shown in Fig.
6, in which the upper horizontal axis gives the frequency scale in the RF spectrum analyzer#97788 - $15.00 USD(C) 2008 OSA

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18 August 2008 / Vol. 16, No. 17 / OPTICS EXPRESS 13059

11

[sweep time = 1000 s and RBW = 1 kHz]. The entire spectrum of the EM-THz comb isobserved using a multi-frequency heterodyning photoconductive process occurring between
the EM-THz comb (with a frequency of f’ = f + Δf) and the PC-THz comb (with a frequency f)[9]. In this process, the observed RF spectrum is a replica of the EM-THz comb downscaled
by a frequency factor of f’/Δf = 16,364,752.4. The actual frequency values in the EM-THz
comb spectrum are given in the lower horizontal axis using the downscale factor. The spectral
bandwidth of the EM-THz comb extends over 1 THz. Since the THz electric field of our
micro-structured, large-area PCA was comparable to that of usual bowtie-shaped LT-GaAs
PCA (= 2 µW) [13], the average power per mode of the EM-THz comb (typically, less than 1nW) is much lower than the average power of usual CW-THz sources. The EM-THz comb
spectrum was clearly observed over 1 THz in spite of such low power, therefore, the THz
spectrum analyzer has high sensitivity even in the THz region. The reason why the average
power per mode of the detected EM-THz comb is below the detection power limit as
mentioned in Sec. 4.1 (= 25 nW) is mainly due to difference of the sweep time of the RF
spectrum analyzer.

Fig. 6. Spectrum of the EM-THz comb. The upper and lower horizontal coordinates give thefrequency scale in the RF and THz spectrum analyzers.

5. Conclusion
We have developed a THz spectrum analyzer that can be used to measure the absolute
frequency and spectral shape of CW-THz sources. The proposed method is based on
photoconductive heterodyning by combining a PCA as the receiver with a PC-THz comb as alocal oscillator having multiple frequencies. Based on a stable THz frequency comb generated
in a PCA, the absolute frequency of a sub-THz test source was determined at the precision of
2.8*10-11. A 2.5-mW, 100-GHz CW test source was demonstrated, and an RF beat signal witha linewidth of 1.35 Hz was observed at a SNR of 50 dB, corresponding to a detection power
limit of 25 nW. Furthermore, we confirmed that the spectral bandwidth of the THz spectrum
analyzer extends over 1 THz using an EM-THz comb as a test source. Consequently, thismethod has the potential to become a powerful tool for practical CW-THz sources in realworld applications.
Acknowledgments
This work was supported by Grants-in-Aid for Scientific Research Nos. 18686008 and
18650121 from the Ministry of Education, Culture, Sports, Science, and Technology of Japan,#97788 - $15.00 USD(C) 2008 OSA

Received 23 Jun 2008; revised 31 Jul 2008; accepted 5 Aug 2008; published 11 Aug 2008

18 August 2008 / Vol. 16, No. 17 / OPTICS EXPRESS 13060

the Tateisi Science and Technology Foundation, and the Mitutoyo Association for Scienceand Technology.

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18 August 2008 / Vol. 16, No. 17 / OPTICS EXPRESS 13061