NANOWORLD® SPM AND AFM PROBES
Nanotechnology is our field. Precision is our tradition.

POINTPROBE®

ULTRA -SHORT CANTILEVERS• most widely used and best known SPM and AFM
probe world-wide• ultra-short cantilevers designed for High-Speed AFM• silicon SPM and AFM probe for very high resolution
imaging• 3 types with very high resonance frequencies (1.2 MHz - 5 MHz)and high force constants for dynamic mode applications in air• 3 types with high resonancefrequencies and low force constants(0.15 N/m - 0.6 N/m) mainly for
applications in liquid• alignment grooves onback side of support chip
• tip radius typically < 8 nm,
guaranteed <12 nm• wear resistant High Density Carbon/
Diamond Like Carbon (HDC/DLC) tip• available with different
tip shapes

PYREX-NITRIDE• tip radius typically < 10 nm

ARROW™

• silicon nitride cantilevers
and tips•optimized positioning throughmaximized tip visibility• designed for various
imaging applications incontact mode or
dynamic mode

• three sided tip defined by real
crystal planes• oxide sharpened
pyramidal tips
• tip radius typically < 10 nm• available either with triangular or rectangularcantilevers• also available as tipless version• special tip shape leads to very
symmetric scans• tip at the very end of the cantilever• tip radius typically < 10 nm, guaranteed < 15 nm• also available as high speed version with a resonancefrequency of up to 2 MHzPOINTPROBE®
SILICON AFM PROBES

Most widely used and best-known high quality
SPM and AFM probe world-wide
Pointprobe® Tip (Standard)
The standard Pointprobe® tip is shaped like a polygon based pyramid.
Its macroscopic halfcone angle is 20° to 25° viewed along the cantilever axis,
25° to 30° when looking from the side and virtually zero at the very tip end.
The Pointprobe® tip is 10 - 15 µm high and shows a tip radius of typically smaller
than 8 nm (smaller than12 nm guaranteed).
General• SPM and AFM probes for very high resolution imaging• fits to all well-known commercial SPMs and AFMs
• cantilever and tip are supported by a single crystal silicon support chip• monolithic design of support chip, cantilever and tip

Pointprobe® Tip.

Material Features• highly doped, single crystal silicon (resistivity 0.01 - 0.025 Ohm cm)• no intrinsic stress and absolutely straight cantilevers• chemically inert silicon for application in fluids or electrochemical cells
Pointprobe® Side View
detector side
tip side

A trapezoidal cross section of thecantilever and therefore 30% wider(e.g. NCH) cantilever detector
side result in easier and faster laser
adjustment. Additionally, because
there is simply more space to place
and reflect the laser beam, a higher
SUM signal is reached.

Cantilever• rectangular cantilever with trapezoidal cross section• wide detector side for easy laser beam adjustment (see sketch on left)• small width at the tip side reduces damping
Support Chip
• cantilever is integrated into a silicon support chip• dimensions of the support chip are very reproducible (3.4 mm x 1.6 mm x 0.3 mm)• alignment grooves on the back side of the silicon support chip in conjunction withthe alignment chip ensure replacement of the probes without major readjustmentof the laser beam
Package Sizes• packages of 10, 20 or 50 AFM probes• full wafer of 380 AFM probes (up to 388 AFM probes depending on the product)

SuperSharpSilicon™ Tip (SSS)
For enhanced resolution of microroughness and nanostructures we have developed
an advanced tip manufacturing process leading to a further improvement of the tip
sharpness with tip radii as small as 2 nm.
With these AFM tips we have pushed back the frontiers of technology.

SuperSharpSiliconTM Tip (SSS)

Tip Features
The tip height is 10 -15 µm and the typical radius of a SuperSharpSilicon™ tip
is about 2 nm. We guarantee a tip radius of smaller than 5 nm (guaranteed yield: 80%).
The half cone angle is smaller than 10° at the last 200 nm of the tip.

High Aspect Ratio Tip (AR5/AR5T)
For measurements on samples with sidewall angles approaching 90°, e.g. deep trenchmeasurements or other semiconductor applications, we offer two different types of High
Aspect Ratio Tips showing near vertical sidewalls.
These tips have an overall height of 10 - 15 µm which allows measurements on highly
corrugated samples. At the last few micrometers the tips show a high aspect ratio
portion that is symmetric when viewed from the side as well as along the cantileveraxis. The tip radius is typically 10 nm (smaller than 15 nm guaranteed).
High Aspect Ratio Tip (AR5)Tip Features
The high aspect ratio portion of the AR5/AR5T tip is larger than 2 μm and shows an
aspect ratio of typically 7:1 (minimum aspect ratio of 5:1 guaranteed).
Consequently the half cone angle of the high aspect ratio portion is typically smaller than
5°. In order to get symmetrical images when scanning deep trenches it is necessary thatthe tip is perpendicular to the sample. Therefore, in order to compensate the most common
tilt angle of 13° used in commercial AFMs, the high aspect ratio portion of the AR5T istilted 13° with respect to the central axis of the tip.

Tilt compensated AR5T
High Aspect Ratio Tip (AR5T)

Diamond Coated Tip (DT), Conductive Diamond Coated Tip (CDT)For SPM and AFM applications that require hard contact between probe and sample werecommend our Diamond Coated Tip (DT). Some typical applications are friction
force measurements, measurement of the elastic properties of samples, as well aswear measurements or nanostructuring. The Conductive Diamond Coated Tip (CDT)
additionally offers a conductive, non passivated coating.
Diamond Coated Tip (DT, CDT)

Tip and Coating Features
True polycrystalline diamond coating on the tip side of the cantilever with theunsurpassed hardness of diamond.
The tip height is 10 - 15 µm and the thickness of the diamond layer is approximately
100 nm. The macroscopic tip radius is in the range of 100 - 200 nm,
but the tip often exhibits a nanoroughness in the 10 nm regime.
In case of the CDT the conductivity is in the range of 0.003 - 0.005 Ohm cm.

.

AVAILABLE COATINGS
Aluminum Reflex Coating• 30 nm thick aluminum reflex coating on the detector sideof the cantilever• enhances reflectance of the laser beam by a factor of 2.5• prevents light from interfering within the cantilever

Diamond Coating• 100 nm thick polycrystalline diamondcoating on the tip side of the cantilever• unsurpassed hardness of the tip• resistance <10 kOhm for CDT

Hard Magnetic/Soft Magnetic Coating• hard magnetic coating: cobalt alloy coating on the tip side of thecantilever• soft magnetic coating: soft magnetic coating on the tip side(coercivity of app. 0.75 Oe, remanence magnetization of app. 225
emu/cm³)• permanent magnetization of the tip

PtIr5 Coating• 25 nm thick platinum iridium5 coating
on both sides of the probe• stress compensated and wear resistant• detector side coating enhances thereflectance of the laser beam by a factorof 2• allows electrical measurements

Gold Coating (on request)• 70 nm thick gold reflex coatingon the detector side of the cantilever• 70 nm thick gold coating
on both sides of the probe

ARROW™
SILICON AFM PROBES

Optimized positioning through maximized tip visibility

General• SPM and AFM probes for high resolution imaging• fit to all well-known commercial SPMs and AFMs
• cantilever and tip are supported by a single crystal silicon support chip• monolithic design of support chip, cantilever and tip
Material Features• highly doped, single crystal silicon (resistivity 0.01 - 0.025 Ohm cm)• no intrinsic stress and absolutely straight cantilevers• chemically inert silicon for application in fluids or electrochemical cells.

ArrowTM Top View

Cantilever• rectangular cantilever with triangular free end• easy positioning of tip on the area of interest due to the Arrow™ shape• consistent distance between tip and cantilever end• trapezoidal cross section with wide detector side for easy laser adjustment
Arrow

TM

Support Chip
• dimensions of the support chip are very reproducible (3.4 mm x 1.6 mm x 0.3 mm)• etched corners of the support chip avoid contact between the support chip and the sample

Front View

Tilt 13°Tip• tip height 10 - 15 µm and radius of curvature typically < 10 nm (< 15 nm guaranteed)• macroscopic half-cone angles- are 30° to 35° seen along the cantilever axis
- are 20° to 25° seen from the side
Package Sizes• packages of 10, 20 or 50 AFM probes• full wafer of at least 380 AFM probes

AVAILABLE COATINGS

Special tip shape leads to extremely
symmetric scan image in x- andy- direction when probe is tilted due
to its mounting on the AFM head.

Reflex Coating• 30 nm thick aluminum reflex coatingon the detector side of the cantilever• enhances reflectance of thelaser beam by a factor of 2.5• prevents light from interfering within
the cantileverPtIr5 Coating• 25 nm thick platinum iridium5 coating
on both sides of the probe• stress compensated and wear resistant• detector side coating enhances the reflectanceof the laser beam by a factor of 2
• allows electrical measurements• Other coatings for standard SPM ans AFM probes available on request

A R R O W ™ Ultra High Frequency Scanning Probes (UHF)A R R O W ™ Tipless Cantilevers and Cantilever Arrays (TL)

Arrow™ UHF
NanoWorld Arrow™ UHF probes have a cantilever capable of resonating with afrequency of up to 2 MHz. These probes combine outstanding sensitivity with fastscanning ability. As for all probes of the Arrow™ series, the Arrow™ UHF probes are
made from monolithic silicon which is highly doped to dissipate static charge. It ischemically inert and offers a high mechanical Q-factor for high sensitivity.
Arrow™ UHF 3D-View

The Arrow™ UHF probes feature a 35 μm long triangular cantilever and a tetrahedral tip
with a height of 3 μm and a radius of curvature smaller than 10 nm.
The unique Arrow™ shape allows easy positioning of the tip on the area of interest.
The reflex coating (aluminum or gold) on the detector side of the cantilever enhances
the reflectance of the laser beam by a factor of 2.5 and prevents light frominterfering within the cantilever.
Arrow™ UHF 3D-View Close-up

Arrow™ TL (Tipless Cantilevers for Special Applications)
The Arrow™ TL SPM and AFM probes have tipless cantilevers and are available
with either 1 cantilever or with cantilever arrays consisting of 2 or 8 rectangularcantilevers with a triangular free end.

ArrowTM UHF

All types of the Arrow™ TL series are optionally available with a gold coating on
the sample facing side of the cantilever.

Cantilever Data
Resonance Frequency

6 kHz

Force Constant

0.03 N/m

Length500 µmWidth (rectangular part)

100 µmThickness

1.0 µmPitch (in case of TL2 and TL8)

250 μmArrow™ TL1
Tipless cantilever,single cantilever beam on silicon
support chip

Arrow™ TL2
Tipless cantilever array,two cantilever beams on a single
silicon support chip

Arrow™ TL8
Tipless cantilever array, eightcantilever beams on a single
silicon support chip

ULTRA -SHORT CANTILEVERS (USC)for High-Speed AFM

General
NanoWorld Ultra-Short Cantilevers (USC) for High-Speed AFM (HS-AFM) combine
very small cantilevers made of a quartz-like material which are designed for resonating
at frequencies of up to 5 MHz and a very sharp and wear resistant High Density
Carbon/Diamond Like Carbon (HDC/DLC) tip.

USC Cantilever 3D View

• especially designed for high speed scanning applications• cannot be used in all commercial SPMs and AFMs due to the small dimensionsof the cantilevers (see next page)• cantilever and tip are supported by a single crystal silicon support chip
• no intrinsic stress and absolutely straight cantilevers
Cantilever• rectangular cantilever with rounded corners at the freestanding end• cantilever made of quartz-like material

USC Support Chip 3D View

USC Tip Front View

Support Chip
• dimensions of the support chip are very reproducible (3.4 mm x 1.6 mm x 0.3 mm)• etched and lowered corners of the support chip avoid contact between the support chipand the sample• alignment grooves on the back side of the silicon support chip in conjunction
with the alignment chip ensure replacement of the probes without major readjustmentof the laser beam
Tip
• nanotools® High Density Carbon/Diamond Like Carbon (HDC/DLC) tip• tip height typically 2.5 μm and radius of curvature typically < 10 nm• tip aspect ratio typically 5:1 and tilt compensation of 8°
Package Size
• package of 10 AFM probes

AVAILABLE COATINGS
USC Tip DetailGold Reflex Coating• 20/30 nm thick gold reflex coating on both sides of the probe• enhances reflectance of the laser beam
• tip remains uncoatedIn order to cover a wide range of possible applications using High-Speed AFM, six
different types of Ultra-Short Cantilevers (USC) have been developed: three types withvery high resonance frequencies (1.2 MHz – 5 MHz) and high force constants mainly for
dynamic mode applications in air and three types with high resonance frequencies andlow force constants (0.15 N/m - 0.6 N/m) mainly for applications in liquid.
USC-F5-k30 Cantilever
3D View

USC mainly for dynamic mode applications in air• resonance frequency of 1.2 MHz and higher• stiffness of 3.0 N/m and higher• mainly designed for applications in non-contact mode in air but can also be used for otherapplications

USC-F5-k30 Cantilever
Top View

USC-F1.2-k0.15 Cantilever
3D View

USC-F1.2-k0.15 Cantilever
Top View

Type

USC-F5-k30

USC-F2-k3

USC-F1.2-k7.3

Resonance Frequency

5.0 MHz

2.0 MHz

1.2 MHz

Force Constant

30 N/m

3.0 N/m

7.3 N/mCantilever length

10 μm

10 μm

20 μm

Cantilever width

5 μm

5 μm

10 μm

Thickness

0.68 μm

0.28 μm

0.67 μm

USC mainly for applications in liquid• resonance frequency of 1.5 MHz and lower• stiffness of 0.6 N/m and lower• mainly designed for applications in liquid but can also be used for applications in air(depending on the application)Type

USC-F1.5-k0.6

USC-F1.2-k0.15

USC-F0.3-k0.3

Resonance Frequency

1.5 MHz

1.2 MHz

0.3 MHz

Force Constant

0.6 N/m

0.15 N/m

0.3 N/mCantilever length

7 μm

7 μm

20 μm

Cantilever width

3 μm

2 μm

10 μm

Cantilever thickness

0.10 μm

0.08 μm0.19 μm* Values in air

For more information on ongoing developments of AFM probes for High-Speed AFM
and for application examples please have a look at: www.highspeedscanning.com

System limitations: due to their small cantilever sizes and their very
high resonance frequencies USC probes currently cannot be used in allcommercially available SPMs and AFMs. Only AFMs with a sufficiently
small laser spot and electronics that are capable of dealing with highresonance frequencies of up to 5 MHz are able to work with the USC
probes. If in doubt whether these probes can be used in your AFM
please check back with us or with your AFM manufacturer.

PYREX-NITRIDE-AFM-PROBES
Leading edge in sharpness and durability

General• SPM and AFM probes for a wide range of applications in contact mode or
dynamic mode
• fit to all well-known commercial SPMs and AFMs
• silicon nitride cantilevers and tips
• cantilevers are supported by a support chip made of pyrex-glass• delivered as separated single support chips for easy handlingPyrex-Nitride AFM probe Close-up

Pyrex-Nitride
Triangular Cantilevers 3D Sketch

Material Features• low-stress silicon nitride for lowest cantilever bending• excellent hardness for wear resistance and extended lifetime
Cantilevers• multi-lever versions with either rectangular cantilevers or triangular cantilevers• single lever version with one triangular cantilever(compatible with PeakForce TappingTM and ScanAsyst® mode)• reflective gold coating on the detector side of the cantilevers• stress compensated with bending below 2°
Support Chip
• support chip made of pyrex-glass (3.4 mm x 1.6 mm x 0.5 mm)• easy handling due to single support chips
Tips• oxide sharpened pyramidal tips
• tip height 3.5 μm and radius of curvature typically < 10 nm• macroscopic half cone angles 35°

Pyrex-Nitride
Rectangular (Diving Board)
Cantilevers 3D Sketch

Package Sizes• packages of 20 or 50 AFM probes

AVAILABLE COATINGSGold Coating• 70 nm thick gold reflex coating on the detector side of the cantilevers enhancesreflectance of the laser beam
• optional 35 nm thick gold coating on the tip side (front side) of the cantilevers
Pyrex-Nitride
Triangular Single Cantilevers
for PeakForce TappingTM and
ScanAsyst® mode 3D Sketch

PYREX-NITRIDE-AFM-PROBES
Triangular Cantilevers (PNP-TR)
Diving Board Shaped Cantilevers (PNP-DB)
Single Triangular Cantilever (PNP-TRS)

Triangular Cantilevers(PNP-TR)

Diving Board Cantilevers(PNP-DB)

Single Triangular Cantilever(PNP-TRS)• triangular shaped cantilevers• multi-lever design• gold reflex coating on the detector sideof the cantilevers• available with gold coating on bothsides of the probe• rectangular diving board shaped
cantilevers• multi-lever design• gold reflex coating on the detector
side of the cantilevers• single triangular shaped cantilever

Cantilever #Cantilever #Cantilever #

Shape

1

2
Triangular

Shape

1

2

Rectangular• one cantilever per chip• gold reflex coating on the detector
side of the cantilever• designed for PeakForce TappingTM
and ScanAsyst® Mode*

1

Shape

TriangularResonance Frequency

67 kHz

17 kHzResonance Frequency

67 kHz

17 kHzResonance Frequency

67 kHzForce Constant

0.32 N/m

0.08 N/m

Force Constant

0.48 N/m

0.06 N/m

Force Constant

0.32 N/m

Length100 µm200 µmLength100 µm200 µmLength100 µm2 x 13.5 µm 2 x 28 µm

Width

40 µm

40 µm

Width

2 x 13.5 µm

Thickness

600 nm

600 nmThickness

600 nmWidthThickness

600 nm

600 nmPNP Tipless (PNP-TR-TL)• triangular Pyrex-Nitride probes
are also available in a tiplessversion• gold reflex coating on thedetector side of the cantilevers• available with gold coating on
both sides of the probe

Pyrex-Nitride AFM Probe
Triangular Tipless Cantilevers

Pyrex-Nitride AFM Probe
Triangular Tipless Long Cantilever
Close-up

Pyrex-Nitride AFM Probe
Triangular Tipless Short Cantilever
Close-up*PeakForce TappingTM and ScanAsyst® are registered trademarks of Bruker Corp.

QUICK SELECTION TABLE
Type

Coating
Coating
Tip Shape
Tip/Front Side Detector Side

Contact Mode

Arrow CONT

--

CONT

-

Arrow CONTR

-

CONTR

-

ZEILR

-

Arrow CONTPt

PtIr5

Contact Mode

Application-

Pointprobe
Reflex (Al)PtIr5

CONTSC-CONTSCR-

Reflex (Al)Contact Modeor Tapping
Mode

PNP-TR(triangularcantilevers)

Cantilever 1-

Reflex(Cr/Au)PNP-TR-Au(triangularcantilevers)

Cantilever 1

Contact Mode
TappingModeContact Mode(short cantilever)

Cr/Au

Cr/Au

Cantilever 2

PNP-DB
Cantilever 1(rectangular
Cantilever 2
cantilevers)-

Arrow NC---

Reflex (Al)NCHR
Non-Contact /TappingMode(high frequency)

Arrow NCPt

PtIr5

®

Arrow™

PtIr5

NCHPt

0.2 N/m

450 x 45 x 2 μm

13 kHz0.2 N/m

450 x 50 x 2 μm

14 kHz0.2 N/m

450 x 45 x 2 μm

13 kHz0.2 N/m

450 x 50 x 2 μm

27 kHz1.6 N/m

450 x 55 x 4 μm
450 x 45 x 2 μm

Pointprobe

13 kHz0.2 N/m

450 x 50 x 2 μm

Pointprobe®

25 kHz0.2 N/m

225 x 48 x 1 μm

67 kHz0.32 N/m 100 x 13.5 x 0.5 μm

17 kHz0.08 N/m 200 x 28 x 0.5 μm

67 kHz0.32 N/m 100 x 13.5 x 0.5 μm

17 kHz0.08 N/m 200 x 28 x 0.5 μm

67 kHz0.48 N/m 100 x 40 x 0.5 μm

17 kHz0.06 N/m 200 x 40 x 0.5 μm

Arrow™

285 kHz160 x 45 x 4.6 μm

Pointprobe®

330 kHz125 x 30 x 4 μm

Arrow™

285 kHz160 x 45 x 4.6 μm

Pointprobe®

330 kHz125 x 30 x 4 μm

Arrow™

285 kHz160 x 45 x 4.6 μm

Pyramidal silicon
nitride®

--SuperSharpSilicon™

AR5-NCHR-

Reflex (Al)High Aspect Ratio (5:1)

AR5T-NCHR (Tilt Compensated)
Non-Contact Mode / TappingMode

14 kHz0.2 N/mSSS-NCHDT-NCHR

Cantilever Length x
Width x Thickness

14 kHz

Pointprobe

AR10-NCHR

Force
Constant®

Reflex(Cr/Au)NCH
Arrow NCR®

Arrow™
Pointprobe

CONTPtCantilever 2

Arrow™

Resonance
Frequency

42 N/m

330 kHz125 x 30 x 4 μm

High Aspect Ratio(10:1)
Diamond

Reflex (Al)Diamond

400 kHz

80 N/m

125 x 30 x 4 μm

NCST

-

-

Pointprobe®

160 kHz

7.4 N/m

150 x 27 x 2.8 μm

NCSTR

-

Reflex (Al)Pointprobe®

NCL

-

-

Pointprobe®

NCLR

-

Reflex (Al)

NCLPt

PtIr5

Ptlr5

SSS-NCL--

SuperSharpSilicon™

190 kHz

48 N/m225 x 38 x 7 μm

AR5-NCLR-

Reflex (Al)High Aspect Ratio (5:1)

DT-NCLR

Diamond

Reflex (Al)Diamond

SEIHR-

Reflex (Al)Pointprobe®

130 kHz

15 N/m225 x 33 x 5 μm

SSS-SEIH--

SuperSharpSilicon™

CDT-NCHR
Non-Contact/
Soft-Tapping
Mode

Non-Contact /TappingMode(long cantilever)

CDT-NCLR
Non-Contact /TappingMode(Seiko NonContact Mode)Pointprobe®

Arrow™

Pyrex-Nitride

Ultra-Short Cantilevers

QUICK SELECTION TABLE
Application

Type

Coating
Tip/Front
Side

Coating
DetectorSide

Tip Shape

Resonance
Frequency

Force
Constant

Cantilever Length x
Width x Thickness

Contact Mode

USC-F1.5-k0.6

Au(tip remains
uncoated)

Reflex (Au)Electron Beam
Deposited(EBD) spike

1.5 MHz

0.6 N/m

7 x 3 x 0.10 μm

1.2 MHz0.15 N/m

7 x 2 x 0.08 μm

0.3 MHz

0.3 N/m

20 x 10 x 0.19 μm

5.0 MHz

30 N/m20 x 5 x 0.68 μm

2.0 MHz

3.0 N/m

10 x 5 x 0.28 μm

1.2 MHz

7.3 N/m

20 x 10 x 0.67 μm

High-Speed AFM

USC-F1.2-k0.15
USC-F0.3-k0.3
Non-Contact /TappingMode

USC-F5-k30

Au(tip remains
uncoated)

USC-F2-k3

Reflex (Au)Electron Beam
Deposited(EBD) spike

USC-F1.2-k7.3
Arrow UHF

Reflex (Al)Arrow UHF-AuD

Reflex (Au)

Arrow™

up to
2.0 MHz
67 kHzPeakForce
PNP-TRS
TappingTM /ScanAsyst® Mode-

Reflex (Al)Pyramidal
siliconnitrideArrow FM--

Arrow™

FM

Pointprobe

Force Modulation Arrow FMR
Mode
FMR

-

DT-FMR

Reflex (Al)35 x 42 x 0.7 μm

0.32 N/m 100 x 13.5 x 0.6 μm

240 x 35 x 3 μm®

75 kHz2.8 N/m

225 x 28 x 3 μm

Arrow™

240 x 35 x 3 μm

Pointprobe®

225 x 28 x 3 μm

Diamond

Reflex (Al)Diamond

Electrostatic Force Arrow EFM
Microscopy
EFM

PtIr5

PtIr5

Arrow™

PtIr5

PtIr5

Pointprobe

Magnetic ForceMicroscopyHardmagnetic

Reflex (Al)Soft
magnetic

Reflex (Al)105 kHz

6.2 N/m

225 x 28 x 3 μm

75 kHz2.8 N/m

240 x 35 x 3 μm

Special Applications

CDT-FMR

MFMR
S-MFMR

Tipless
Cantilevers

Arrow TL1

1 cantilever--

Arrow TL1-Au

1 cantilever

Ti/Au

-

Arrow TL2

Array of 2 cantilevers--

Arrow TL2-Au

Array of 2 cantilevers

Ti/Au

-

Arrow TL8

Array of 8 cantilevers--

Arrow TL8-Au

Array of 8 cantilevers

Ti/Au

-

PNP-TR-TL

triangularcantilevers

Cantilever 1-

triangularcantilevers

Cantilever 1

PNP-TR-TL-Au

Pointprobe®

75 kHz2.8 N/mTipless silicon

6 kHz

0.03 N/m 500 x 100 x 1 μm

67 kHz0.32 N/m 100 x 13.5 x 0.6 μm

17 kHz0.08 N/m 200 x 28 x 0.6 μm

67 kHz0.32 N/m 100 x 13.5 x 0.6 μm

17 kHz0.08 N/m 200 x 28 x 0.6 μm

Cantilever 2

Cantilever 2

Au

Reflex (Au)

225 x 28 x 3 μm®

Tipless silicon
nitrideFor further information please visit our website at www.nanoworld.com. All data are subject to change. NanoWorld® and Pointprobe® are registered trademarks of NanoWorld AG.
PeakForce TappingTM and ScanAsyst® are registered trademarks of Bruker Corp.

225 x 28 x 3 μm

POINTPROBE®

About NanoWorld
Nanotechnology is our field. Precision is our tradition.
Innovation is our key instrument.
That’s why we are located in Switzerland,
one of the most powerful and innovative areas in Europe.
Using our knowledge as well as our high precision SPM and AFM probes, ourclients achieve the best results with Scanning Probe Microscopy (SPM) and with
Atomic Force Microscopy (AFM).

ARROW™

The wide selection of tip shapes, spring constants, resonance frequencies andcoatings translates to the most appropriate probe for your research as well as
industrial applications.
The Pointprobe® Silicon AFM probes are the most widely used and best known
AFM probes world-wide and have become the standard probes in many laboratories. The AFM probes of the Pointprobe® series are available in many different
cantilever versions and tip shapes.
The AFM probes of the Arrow™ series feature a unique tip shape that allows
easy positioning of the tip on the area of interest. The Arrow™ UHF version isdesigned for high speed scanning with a resonance frequency of up to 2 MHz.

ULTRA -SHORTCANTILEVERS

With the Ultra-Short Cantilevers series NanoWorld now offers a whole rangeof AFM probes for High-Speed AFM. They are designed to resonate at frequencies of up to 5 MHz and feature a very wear resistant tip made of High Density
Carbon/Diamond Like Carbon (HDC/DLC). Three different versions mainly for
applications in air and three different versions mainly for applications in liquid
are currently available.
The PNP Silicon Nitride AFM probes are available as versions with multiple
triangular cantilevers, a version with a single triangular cantilever as well as a
version with multiple rectangular cantilevers. They feature a pyramidal silicon
nitride tip with a radius of curvature smaller than 10 nm. Tipless triangular silicon
nitride cantilevers with either gold coating on the detector side or on both sidesof the cantilevers are also available.

PYREX-NITRIDE

NanoWorld AG
Headquarters
Rue des Saars 10
CH-2000 Neuchâtel
Switzerland

Phone: +41 325 521 515
Fax: +41 325 521 516
e-mail: info@nanoworld.com
web: www.nanoworld.com