Pacifico Yokohama
Yokohama, Japan

19–22 April 2022

Optical Technology and Measurement
for Industrial Applications Conference

CONFERENCE CHAIRS(OPTM 2022)

Program Committee: Masato Aketagawa, Nagaoka Univ. of Technology (Japan); Yasuhiko Arai, Kansai
Univ. (Japan); Prathan Buranasiri, King Mongkut’s Institute of Technology Ladkrabang (Thailand); Jürgen
W. Czarske, TU Dresden (Germany); Motoharu Fujigaki, Univ. of Fukui (Japan); Amalia Martínez-García,
Centro de Investigaciones en Óptica, A.C. (Mexico); Satoshi Gonda, National Institute of Advanced Industrial
Science and Technology (Japan); Sen Han, Univ. of Shanghai for Science and Technology (China); Feng-Lei
Hong, Yokohama National Univ. (Japan); Nathan Hagen, Utsunomiya Univ. (Japan); Hideki Ina, Canon Inc.
(Japan); Ichiro Ishimaru, Kagawa Univ. (Japan); Lianhua Jin, Univ. of Yamanashi (Japan); Daesuk Kim,Chonbuk National Univ. (Korea, Republic of); Jonathan D. Kofman, Univ. of Waterloo (Canada); Kazuhide
Kamiya, Toyama Prefectural Univ. (Japan); Qian Kemao, Nanyang Technological Univ. (Singapore); Fumio
Koyama, Tokyo Institute of Technology (Japan); Ryoichi Kuwano, Hiroshima Institute of Technology (Japan);Yu-Lung Lo, National Cheng Kung Univ. (Taiwan); Yasuhiro Mizutani, Osaka Univ. (Japan); Christian Rembe,Technische Univ. Clausthal (Germany); Yukitoshi Otani, Utsunomiya Univ. (Japan); Pavel Pavlicek, PalackýUniv. Olomouc (Czech Republic); Takamasa Suzuki, Niigata Univ. (Japan); Satoru Takahashi, The Univ.
of Tokyo (Japan); Toshiyuki Takatsuji, National Institute of Advanced Industrial Science and Technology(Japan); Toshitaka Wakayama, Saitama Medical Univ. (Japan); Wei-Chung Wang, National Tsing Hua Univ.
(Taiwan); Gao Wei, Tohoku Univ. (Japan); Jiangtao Xi, Univ. of Wollongong (Australia); Hayato Yoshioka,
Tokyo Institute of Technology (Japan); Song Zhang, Purdue Univ. (United States)
Papers on the following and related topics are solicited for this conference:• 3D profilometry• polarimetry/ellipsometry• novel optical testing• surface inspection methods and applications• absolute testing for metrology• application of interferometric techniques• machine/robot vision methods, architectures
andapplications• lighting methods and systems for inspection• dynamic measurement• unique optical systems for inspection
andmeasurements• 2D and 3D machine vision methods andapplications• 3D data acquisition• freeform testing• scatterometry• unconventional microscope for inspection• super-high accurate measurement for smoothsurfaces• micro- and nano-scale measurement methods• structured light methods, fringe
projectionmeasurement and applications• phase shifting methods applied toindustrialinspection• mechanic-optics and photonics for
metrologyand inspection• optical inspection by optical comb
• super resolution microscope for inspection• spherical and aspherical measurements• color metrology of manufactured goods• on-line and process control measurements• on-machine tool measurements of shapeandfinish• high-resolution and high-speed
inspectionapplications• novel interferometry.

Submit your abstract today
https://opicon.jp/conferences/OPTM

Toru Yoshizawa
NPO 3D Associates,Japan

Takeshi Hatsuzawa
Tokyo Institute ofTechnology (Japan)

Rainer Tutsch
Technische Univ.
Braunschweig (Germany)

Submission Deadline

4 February 2022