AUTOMOTIVE CURRENT TRANSDUCER OPEN LOOP TECHNOLOGY
HAH1BV S/D24

Introduction

Automotive application

The HAH1BV family is for the electronic measurement of
DC, and low frequency current in high power and low voltage
automotive applications with galvanic separation between
the primary circuit (high power) and the secondary circuit(electronic circuit).

● Battery Management.

The HAH1BV family gives you the choice of having different
current measuring ranges in the same housing.

Features● Open Loop transducer using the Hall effect● Low voltage application● Unipolar +5 V DC power supply● Primary current measuring range −600 A / +300 A (highrange) −100 A / +150 A (low range)
busbar to have T < +150 °C● Operating temperature range: −40 °C < T < 70 °C● Output voltage: full ratio-metric (in sensitivity and offset)● Compressor limiter for M6 screw

The Hall voltage is thus expressed by:
UHall = (cHall / d) × IHall × a × IP
Except for IP, all terms of this equation are constant.
Therefore:
UHall = b × IP

● Maximum RMS primary admissible current: defined bySpecial features

The open loop transducers uses a Hall effect integrated circuit.
The magnetic flux density B, contributing to the rise of the Hall
voltage, is generated by the primary current IP to be measured.
The current to be measured IP is supplied by a current source
i.e. battery or generator (Figure 1).
Within the linear region of the hysteresis cycle, B is proportionalto:
B (IP) = a × IP

● Ratiometric transducer● Customer 2D Matrix.

Principle of HAH1BV Familyaconstantb

constant

cHall

Hall coefficientdthickness of the Hall plate

IHall

current across Hall plates

The measurement signal UHall is amplified to supply the user
output voltage or current.

● Dual output● Unsealed connector.

+ UC

IP

Advantages● Excellent accuracy- UC● Very good linearity● Very low thermal offset drift● Very low thermal sensitivity drift

Uout

Primary Current IP

0V

Insulated Output Voltage Uout

Fig. 1: Principle of the open loop transducer.

● Galvanic separation● Non intrusive solution.
N° 97.D3.99.D24.0
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LEM International SA
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1217 Meyrinwww.lem.com

HAH1BV S/D24

Dimensions (in mm)

IP

Mechanical characteristics

Remark● Plastic case		PBT GF 30● Magnetic core		

Iron silicon alloy● Uout > 2.5 when IP flows in the direction of the arrow.
Uout

Diagnostic● Mass		
45 g (±5 %)Open circuit

Uin ≤ 0.15 V● Electrical terminal coating Brass tin plated

Short GND

Uin ≤ 0.15 V

Mounting recommendation● Connector type		

Tyco 1473672-1

Electronic schematic

System architecture (example)
RL > 10 kΩ optional resistor for signal line diagnostic
CL ≤ 100 nF EMC protection
RC Low pass filter EMC protection (optional)
LEM trans ducer+5 V DC

UC

Components list
IC

Hall transducer ASICC

Decoupling capacitor

Pin out
A

Uout1 (Low Range)

B

GroundC

UC (5 V)D

Uout2 (High Range)

LEM dual die
Gnd

4.7 uF

4.7 uF

47 nF

Gnd

Hall
cell

IP M

Typical application schematic interface

68 nF

R

Uout1

Primary
current

Hall
cell

CL

Uout2
68 nF

C

RL

R

CL

RL

C

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LEM International SA
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HAH1BV S/D24

Absolute ratings (not operating)Parameter
Maximum primary current peak
Supply over voltage
Reverse voltage

SymbolUnitÎP maxA

UC

V

Specification
Min

Typical

2)

14
−14

Maximum output voltage

Uout maxV−14

Maximum output current

Iout max

mA

−10

tC

°C

∞

Output short-circuit duration
Electrostatic discharge voltage (HBM)

Conditions

Max

14
10

UESD HBMkV

8

JESD22-A114-B

RMS voltage for AC insulation test

Ud

kV

2

50 Hz, 1 min ISO 6469 3622

Insulation resistance

RINS

MΩ

1000

Ambient storage temperature

TA st

°C

−40

Creepage distance

dCp

mm

5

Clearance

dCI

mm

3.87

Comparative tracking index

CTI

500 V - ISO 16750-2
125

50 Hz, 1 min ISO 6469 3622

PLC3 (175 V − 250 V)

Operating characteristics in high/low range (IP N)
Parameter

Specification
TypicalMax

SymbolUnit

Primary current, measuring range, high range

IP M

A

−600

300

2)

Primary current, measuring range, low range

IP M

A

−100

150

2)

Supply voltage

1)

UC

V

4.75

Ambient operating temperature

TA

°C

−40

Output voltage

Uout

V

Uout = (UC/5) × (UO + S × IP )Sensitivity high range

S

mV/A

4.444

@ TA = 25 °C

Sensitivity low range

S

mV/A

16

@ TA = 25 °C

Offset voltage high range

UO

V

3.167

@ TA = 25 °C

Offset voltage low range

UO

V

2.1

@ TA = 25 °C

mV

1.25

Min

Conditions

Electrical Data

Output resolution
Output clamping high voltage

US Z

V

Output clamping low voltage

US Z

V

Current consumption

IC

mA

Load resistanceRLΚΩ

Output internal resistance

Rout

Ratiometricity error

εr

4.74

5

5.25
70

4.75
0.25

@ UC = 5 V
0.26

14

@ UC = 5 V@ TA = 25 °C, @ UC = 5 V

21
10@ TA = 25 °C
1Ω@ TA = 25 °C
10Performance DataεS

Sensitivity error
Electrical offset voltage

UO E

Magnetic offset voltage low range

%
%
mV

±0.2

@ TA = 25 °C

−1.5

1.5

−2.72

2.72

@ TA = 25 °C, after endurance test

−20

20

@ TA = 25 °C, @ UC = 5 V (initial state)

−33

33

@ TA = 25 °C, after endurance test

−3.54

5.31

@ UC = 5 V, in temperature range

−5.90

2.95

@ UC = 5 V, in temperature range% of full scale, @ TA = 25 °C

UO M

mV

εL

%

−0.5

0.5

Average temperature coefficient of UO E

TCUO E AV

mV/°C−0.113

0.113

Average temperature coefficient of S

TCSAV

%/°C

−0.03

0.03

Delay time to 90 % to the final output value for IP N step

tD 90

ms

Frequency bandwidth 2)

BW

Hz

Peak-to-peak noise voltage

Uno ppmV

10Output RMS voltage noise

Uno

mV

1.6

Start-up time

tstartms

10

Setting time after overload

ts

ms

10

Magnetic offset voltage high range
Linearity error@ TA = 25 °C (initial state)

10140@ −3 dB
DC to 1 MHz@ UC = 4.75 V

Notes: 1) The output voltage Uout is fully ratiometric. The offset and sensitivity are dependent on the supply voltage UC relative		 to the following formula:
IP = (
2)

5
1
× Uout − UO) ×
with S in (V/A)
S
UC

Primary current frequencies must be limited in order to avoid excessive heating of the busbar, magnetic core and the ASIC (seefeature paragraph in page 1.)

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LEM International SA
Route du Nant-d’Avril, 152
1217 Meyrinwww.lem.com

HAH1BV S/D24

Data from PV tests
εS

εS

εS

εS

UO E

UO E

UO E

UO E

UO M

UO M

UO M

UO M

εL AV

εL AV

εL AV

εL AV

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LEM International SA
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1217 Meyrinwww.lem.com

PERFORMANCES PARAMETERS DEFINITIONS
Primary current definition:
Uout

Primary current nominal (IP N)

HAH1BV S/D24
Delay time tD 90:
The time between the primary current signal (IP N) and theoutput signal reach at 90 % of its final value.
I [A]Primary current, measuring range (IP M)

IT

90 %
Uout

IP

IP

tD 90

Definition of typical, minimum and maximum values:
Minimum and maximum values for specified limiting and safety
conditions have to be understood as such as values shown in“typical” graphs. On the other hand, measured values are partof a statistical distribution that can be specified by an intervalwith upper and lower limits and a probability for measured
values to lie within this interval. Unless otherwise stated(e.g. “100 % tested”), the LEM definition for such intervals
designated with “min” and “max” is that the probability forvalues of samples to lie in this interval is 99.73 %. For a normal(Gaussian) distribution, this corresponds to an interval between−3 sigma and +3 sigma. If “typical” values are not obviouslymean or average values, those values are defined to delimit
intervals with a probability of 68.27 %, corresponding to aninterval between −sigma and +sigma for a normal distribution.
Typical, minimum and maximum values are determined during
the initial characterization of a product.
Output noise voltage:
The output voltage noise is the result of the noise floor of theHall elements and the linear amplifier.
Magnetic offset:
The magnetic offset is the consequence of an over-current on
the primary side. It’s defined after an excursion of IP N.
Linearity:
The maximum positive or negative discrepancy with a reference
straight line Uout = f (IP).
Unit: linearity (%) expressed with full scale of IP N.
Uout

Non linearity example

Referencestraight line
Max linearity error

IP
Linearity variation in IP Nt [µs]

Sensitivity:
The transducer’s sensitivity S is the slope of the straight line
Uout = f (IP), it must establish the relation:
Uout (IP) = UC/5 (S × IP + Uo)

Offset with temperature:
The error of the offset in the operating temperature is thevariation of the offset in the temperature considered with theinitial offset at 25 °C.
The offset variation IO T is a maximum variation the offset in thetemperature range:
IO T = IO E max − IO E min

The offset drift TCIO E AV is the IO T value divided by the temperature
range.
Sensitivity with temperature:
The error of the sensitivity in the operating temperature is therelative variation of sensitivity with the temperature consideredwith the initial offset at 25 °C.
The sensitivity variation ST is the maximum variation (in ppm or%) of the sensitivity in the temperature range:
ST = (Sensitivity max − Sensitivity min) / Sensitivity at 25 °C.
The sensitivity drift TCSAV is the ST value divided by thetemperature range. Deeper and detailed info available is ourLEM technical sales offices (www.lem.com).
Offset voltage @ IP = 0 A:
The offset voltage is the output voltage when the primary current
is zero. The ideal value of UO is UC/2. So, the difference of
UO − UC/2 is called the total offset voltage error. This offset error
can be attributed to the electrical offset (due to the resolution of
the ASIC quiescent voltage trimming), the magnetic offset, thethermal drift and the thermal hysteresis. Deeper and detailed
info available is our LEM technical sales offices (www.lem.
com).
Environmental test specifications:
Refer to LEM GROUP test plan laboratory CO.11.11.515.0 with
“Tracking_Test Plan_Auto” sheet.

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LEM reserves the right to carry out modifications on its transducers,in order to improve them.

LEM International SA
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1217 Meyrinwww.lem.com

HAH1BV S/D24

Insulation characteristics
Standards
dCl (Clearance distance)>2.6 mm (according to EN 60664: Category overvoltage OV2,
Altitude correction factor for 4000 m: 1.29).

dCp (Creepage distance)>5 mm (according to EN 60664: Pollution degree PD2,
inhomogeneous field, Class 1 basic insulation, CTI comparative tracking Index -group III a-: 200)
Regulation and standards:

Dielectric rigidity

Test method: according to ISO 16750-2, applied voltage 2000 V AC during 1 minuteRequirements: Neither dielectric breakdown nor flashover shall occur during the test.
Regulation and standards:- ECE R100

Insulation regulation
Requirements: Insulation resistance shall be greater than 1G ohm.
Test method according to ISO 16750-2 (test voltage 500 V during 1 minute)

PV tests
Transducers PV tests plan
HAH1BV S/D24- Nissan Standards 28401NDS01 and 28401NDS02

Test Standards

Specific Conditions

VI/01

Resonance-point detecting test

2840NDS01[12] § VI/01

Vibration frequency: 10 to 1000 Hz
Sweeping cycle: 33 min (Sweep rate: 1 Hz/s)
Vibration acceleration: 9.81 m/s2
Maximum amplitude: 20 mm peak/peak

VI/05

Resonance-point 1 h oscillation test

2840NDS01[12] § VI/05

Vibration acceleration: 29.43 m/s2
Vibration frequency: 10 to 1000 Hz
duration: 1 h for each direction

MS/03

Collision Impact

2840NDS01[12] § MS/03

MS/02

Mounting operator shock test

2840NDS01[12] § MS/02

CL/03

Warm Storage

2840NDS01[12] § CL/03

High temperature storage: 70 °C - Humidity ≤ 50 % RH.
>1 h (device thermal inertia)
Soak time t3 = 48 h
Estimated duration: 51 h

CL/04

Cold Storage

2840NDS01[12] § CL/04

Low temperature storage : −40 °C
t1 + t2 <1 h (device thermal inertia)
Soak time t3 = 24 h
Estimated duration: 27 h

MS/07

Curbstone shocks test

2840NDS01[12] § MS/07

acceleration: 400 m/s2
duration: 11 ms
1 shocks per axis (total of 6 shocks)

CL/06

Climatic Sequence

2840NDS01[12] § CL/06

Upper temperature: 70 °C
Upper relative humidity: 96 % RH
Lower temperature: −10 °C
duration : 10 cycle of 24 h

MS/01

Free Fall

2840NDS01[12] § MS/01

Number of axis: 3
Falls per device: 2 (1 per direction)
Drop height: 1 m

VI/07

Random Vibration Endurance

2840NDS01[12] § VI/07

Tmin = −40°C ; Tmax= +70 °C
Frequency range tested: 5 to 1000 Hz
Level: 2.4 g RMS
Total test duration for each axes: 36 h

acceleration: 400 m/s2
duration: 11 ms
1 shocks per axis (total of 6 shocks)
acceleration: 100 m/s2
duration: 6 ms
3 shocks per axis (total: 18 shocks)

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LEM International SA
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1217 Meyrinwww.lem.com

HAH1BV S/D24
Transducers PV tests plan
HAH1BV S/D24- Nissan Standards 28401NDS01 and 28401NDS02

Test Standards

Specific Conditions

CH/12

Corrosive Atmosphere

2840NDS01[12] § CH/12

Descriptions of the Flowing mixed gas:
IEC 60068-2-60 “Ke” (12.1995) Method 4
Duration (days): 21 Days

CL/15

Continuous Humidity

2840NDS01[12] § CL/15

Temperature : 40 ±2 °C
Relative humidity : 95 ± 5 % RH
DUT with wire-harness connected. No power supply.
duration : 1000 h

2840NDS01[12] § LT/01

Upper temperature: 120 °C
Lower temperature: −40 °C
Duration of transition: ~10 °C/min
Duration of stabilization temperature (min): 30 min
Number of cycles: 652
Duration of exposure : 652 h

LT/01

Thermal cycling life

CL/11

Withstand voltage

2840NDS01[12] § CL/11

RMS voltage for AC insulation test at 50 Hz: 0.5 kV
Hold time: 60 s
Rise time: 1 sec for 500 A
Fall time: 1 sec for 500 A
Detection: ΔI + Imax
Leakage current limit: 2 mA

CL/12

Insulation Resistance

2840NDS01[12] § CL/12

Temperature: Room temperature
Test voltage 500 V DC
Hold time: 60 s

LT/02

Constant humid heat life

2840NDS01[12] § LT/02

Temperature: 85 °C
Relative humidity: 85 %Duration total of exposure: 1000 h

LT/03

Thermal life & Combined load

2840NDS01[12] § LT/03

Upper temperature: 125 °C
Lower temperature: 70 °C
Duration of exposure: 1573 h
Number of cycles: 793

CL/01

Thermal shock endurance

2840NDS01[12] § CL/01

Upper temperature: 125 °C
Lower temperature: −40 °C
Duration of Upper / Lower temperature: 15 min
Transition time: <10 s
Number of cycles: 1000
Duration of exposure: ~1000 h

CL/08Warm Operation

2840NDS01[12] § CL/08

Temperature: 70 °C
Relative humidity: Uncontrolled
Duration of exposure: 8 h

CL/09

Cold operation

2840NDS01[12] § CL/09

Temperature: −40 °C
Relative humidity: Uncontrolled
Duration of exposure: 24 h

LT/00

Temperature Equivalent Δteq

2840NDS01[12] § LT/00

Temperature: −40 … 70 °C
Relative humidity: Uncontrolled
Number of steps: 6
Duration of temperature steps:
1 h soak time + DUT operating time until saturation
temperature
IP= 80 A

CL/07

Temperature Range

2840NDS01[12] § CL/07D

Upper temperature: 80 °C
Lower temperature: −40 °C
From Tamb to −40 °C up to 80 °C
Number of steps: 25

2840NDS01[12] § CL/13

Method 2 if "CL/13 Table 1 : Activation profiles" fulfilled
by Renault/Nissan before the beginning of the test, else
Method 1.
Activation profiles :- Saturation temp 2: Temperature : 40 °C ; Primary
current : 200 A, 15 min- Saturation temperature 1' Temperature : 25 °C ;Primary current : −170 A 40 min −> −340 A 15 sec −>−170 A 40 min- 'Sequence temperature 1' Temperature : 25 °C ;Primary current : −170 A 40 min −> +125 A 40 min −>+30 A 30 min−> −170 A 40 min −> 0 A 2 h

CL/13

Check of saturation Temperature

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LEM reserves the right to carry out modifications on its transducers,in order to improve them.

LEM International SA
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1217 Meyrinwww.lem.com

HAH1BV S/D24
Transducers PV tests plan
HAH1BV S/D24- Nissan Standards 28401NDS01 and 28401NDS02

EQ/IR 03

Resistance to electrostatic discharges, equipment
not supplied

Test Standards

2840NDS02[7] § EQ/IR03

Specific Conditions- Contact discharge: ±4 kV and ±8 kV- Air discharge: ±15 kV- Discharge network : 150 pF / 330 Ω.
UC = NO power supply (≡ unconnected)
Criteria A after reconnection

EQ/IC 07

Immunity to signal line transients

2840NDS02[7] § EQ/IC07

Test :- Apply pulses 3a (−150 V) for 10 minutes
and pulses 3b (+100 V) for 10 minutes to thecapacitive coupling clamp while monitoring
the EUT.
- Application point: Signal line, busbar-Connect the BMS imitation board which LEM
made in DV phase validation.
50 Ω load.
Monitoring :- Uout1 and Uout2 were monitored via
oscilloscope and RMS multimeter- Additional UC was monitored via oscilloscope
Criteria A. The fluctuation voltage andduration time shall be in the range of DV test
result.

EQ/IC 11

EQ/IC 04

Resistance to impulsive transient

Resistance to power supply micro-interruptions

EQ/IC 08

Immunity to bulk current injection (BCI)

EQ/IR 01

Immunity to radiated field (semi-anechoic or
anechoic chamber)

EQ/IR 02

Immunity to audio frequency magnetic field

2840NDS02[7] § EQ/IC11

Run the EUT for a minimum duration of 10
minutes.
- Specified positive impulse for 20 s minimum.
- Specified negative impulse for 20 s
minimum.
- Pulse width 50 ns, 100 ns and 400 ns.
- Pulse amplitude : ±400 V- Wires involved : all wires, one by one.
Use 470 pF coupling capacitor.
Criteria A

2840NDS02[7] § EQ/IC04

Power supply 5.0 V
Run the EUT for a minimum duration of 10
minutes.
Wires involved for micro-interruptions of 10
μs (connectors): all power supply wire taken
separately and simultaneously.
external load (2 Ω) shall be connected inparallel with EUT
Criteria A. The fluctuation voltage andduration time shall be in the range of DV test
result.

2840NDS02[7] § EQ/IC08

Reference value :60 mA Class-A
100 mA Class-B
200 mA Class-C

2840NDS02[7] § EQ/IR01

Substitution method.
200 MHz ~ 2 GHz, 60 V/m − Class-A
200 MHz ~ 2 GHz, 100 V/m − Class-B
200 MHz ~ 2 GHz, 200 V/m − Class-C

2840NDS02[7] § EQ/IR02

The EUT must be placed directly between theloop antenna (Helmholtz coils)
Frequency range 15 Hz to 200 kHz
Apply the test "Magnetic field test level 1”
Criteria A

EQ/IR 05

Resistance to handy transmitters

2840NDS02[7] § EQ/IR05

Power supply 5 V DC
Length of the harness 1.5 m
Power Return leads Grounded before LISN
only
Frequency range 28 MHz – 2590 MHz 32
Antennas
Class: Level 1: A / Level 2: C
Gravity: Level 1: 0 / Level 2: 2
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7February2023\Version 1

LEM reserves the right to carry out modifications on its transducers,in order to improve them.

LEM International SA
Route du Nant-d’Avril, 152
1217 Meyrinwww.lem.com