AUTOMOTIVE CURRENT TRANSDUCER OPEN LOOP TECHNOLOGY
HAH1BVW S/15

Introduction

Principle of HAH1BVW Family

The HAH1BVW family is for the electronic measurement of DC,
AC or pulsed currents in high power and low voltage automotive
applications with galvanic separation between the primarycircuit (high power) and the secondary circuit (electronic circuit).

The open loop transducers uses a Hall effect integrated circuit.
The magnetic flux density B, contributing to the rise of the Hall
voltage, is generated by the primary current IP to be measured.

The HAH1BVW family gives you the choice of having different
current measuring ranges in the same housing.

The current to be measured IP is supplied by a current source
i.e. battery or generator (Figure 1).
Within the linear region of the hysteresis cycle, B is proportional
to:Features

B (IP) = a × IP
The Hall voltage is thus expressed by:

UHall = (cHall / d) × IHall × a × IP

● Ratiometric transducer● Open Loop transducer using the Hall effect● Low voltage application

Except for IP, all terms of this equation are constant.
Therefore:● Unipolar +5 V DC power supply

UHall = b × IPaconstantbconstantcHall
Hall coefficient
dthickness of the Hall plate
IHall
current across the Hall plates● Primary current measuring range ±1500 A● Maximum RMS primary admissible current: defined bybusbar to have T < +150 °C● Operating temperature range: −40 °C < T < 125 °C● Output voltage: full ratio-metric (in sensitivity and offset).

Advantages

The measurement signal UHall amplified to supply the user
output voltage or current.

● Excellent accuracy● Very good linearity+ UC● Very low thermal offset drift

IP● Very low thermal sensitivity drift● Galvanic separation- UC● Non intrusive solution.
Primary Current IPAutomotive application● Battery Management.

0V

Insulated Output Voltage Uout

Fig. 1: Principle of the open loop transducer.

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HAH1BVW S/15

Dimensions (in mm)

Mechanical characteristics

Remark● Plastic casePBT GF 30● Magnetic core

FeSi alloy● Uout > Uo when IP flows in the positive direction (see arrowon drawing).

● Mass57 g ±5 %● PinsBrass tin plated● IP level

IPx 2.

System architecture (example)
LEM sensor

IP M

TYCO connector P/N 1473672-1● Assembly torque max

2.2 N٠m ±5 %● Soldering type

N/A.

RL > 10 kΩ. Resistor for signal line diagnostic (optional)

ICHall sensor ASIC

C1

Decoupling capacitor

100 nFC2

EMC protection capacitor

68 nF

Pin out
Magnetic
core

RL

MagneticCore

On board diagnostic
Components list

Primarycurrent

CL

CL < 100 nF EMC protection (optional)
RC Low pass filter (optional)

Electronic schematic
IP M

+5 V

Uout
C2

● Mating connector type

Typical application
Schematic interface

C1

Primary
Current

Mounting recommendation+5 V

UC+5 V

A
B
C
D

Uout

Open circuit
Short GND

Diagnostic
UIN ≤ 0.15 V
UIN ≤ 0.15 V

Uout

GND

UC (5 V)not connected
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Absolute ratings (not operating)Parameter

Specification
TypicalMax

SymbolUnit

UC maxV

Maximum reverse supply voltage

UC maxV−14

Maximum output voltage

Uout max

V−1414

Maximum output current

Iout max

mA

−10

10−40

125

Maximum supply voltage

Ambient storage temperature

MinConditions

14

Uout Reverse / Forward voltage

TA st°C

UESD HBMkV8

Maximum admissible vibration (random RMS)

γmax

m·s-227.1

10 to 1000 Hz, −40 °C to 125 °C

RMS voltage for AC insulation testUdkV

2.5

50 Hz, 1 min

Creepage distance

dCpmm

4.85

Clearance

dCImm

4.85

Comparative tracking index

CTI

Electrostatic discharge voltage (HBM)

PLC 3

Operating characteristics in nominal range (IP N)
Parameter

SymbolMin

Specification
TypicalMax

A

−1500

1500

Unit

Conditions

Electrical Data
Primary current, measuring range

IP M

Primary nominal RMS current

IP N

A

−1500

Supply voltage

UCV

4.5

Ambient operating temperature

TA°C−40Output voltage

UoutV

Uout = (UC/ 5) × (Uo + S × IP )Sensitivity

SmV/A

1.333

Offset voltage

UOV

2.5

Output resolution

mV150055.5125@ TA = 25 °C

2.5

Output clamping high voltage

US Z

4.7

4.75

4.8

@ UC = 5 V

Output clamping low voltage

US Z

0.2

0.250.3@ UC = 5 V

Current consumption

ICmA

Load resistance

RLΚΩOutput internal resistanceRoutΩRatiometricity errorεr@ TA = 25 °C, @ UC = 5 V

71010@ TA = 25 °C

110Performance Data%±0.2

Sensitivity error

εS%±2@ TA = 25 °C, @ UC = 5 V

Electrical offset voltage

UO E

mV±3@ TA = 25 °C, @ UC = 5 V

Magnetic offset voltage @ IP = 0 V

UO M

mVLinearity error

εL%

Average temperature coefficient of UO E

TCUO E AV

mV/°C

±0.06

Average temperature coefficient of S

TCS AV%/°C±0.02

Delay time to 90 % to the final output value for IP N step

tD 90

ms

Frequency bandwidthBWHz

Peak-to-peak noise voltage

Uno ppmV

10Output RMS noise voltage

UnomV

1.6

Start-up timetstartms

1

Settling timetsms10±2−1@ UC = 5 V, @ TA = 25 °C
1% of full scale@ UC = 5 V

1070@ −3 dB
DC to 1 MHz

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Total error εtot

Total error εtot @ UC = 5 V (–40 °C ≤ TA ≤ 125 °C)
60|ɛtot| (mV)

50
4030
20
100-1500-1200-900-600-3000300

600

900

1200

1500

IP (A)Total error @ 25 °C

Total error @ T Range

Total error εtot specification. Max value @ ±3 δ
Typical values
TA = 25 °C, UC = 5 V

IP (A)

Maximum values−40 °C ≤ TA ≤ 125 °C, UC = 5 V

150039 mV

29.26 A

1.95 %

55 mV

41.26 A

2.75 %

120019 mV

14.25 A

0.95 %

38 mV

28.51 A

1.90 %

07 mV

5.25 A

0.35 %

10 mV

7.5 A

0.50 %−120019 mV

14.25 A

0.95 %

38 mV

28.51 A

1.90 %−150039 mV

29.26 A

1.95 %

55 mV

41.26 A

2.75 %

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LEM reserves the right to carry out modifications on its transducers,in order to improve them, without prior notice

LEM International SA
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HAH1BVW S/15

PERFORMANCES PARAMETERS DEFINITIONSDelay time tD 90:

Primary current definition:

The time between the primary current signal (IP N) and theoutput signal reach at 90 % of its final value.

UoutI [A]Primary current nominal (IP N)
Primary current, measuring range (IP M)

IT90 %UoutIPtD 90IPDefinition of typical, minimum and maximum values:
Minimum and maximum values for specified limiting and safety
conditions have to be understood as such as values shown in“typical” graphs. On the other hand, measured values are partof a statistical distribution that can be specified by an intervalwith upper and lower limits and a probability for measured
values to lie within this interval. Unless otherwise stated(e.g. “100 % tested”), the LEM definition for such intervals
designated with “min” and “max” is that the probability forvalues of samples to lie in this interval is 99.73 %. For a normal(Gaussian) distribution, this corresponds to an interval between−3 sigma and +3 sigma. If “typical” values are not obviouslymean or average values, those values are defined to delimit
intervals with a probability of 68.27 %, corresponding to aninterval between −sigma and +sigma for a normal distribution.
Typical, minimum and maximum values are determined during
the initial characterization of a product.

Output noise voltage:t [µs]

Sensitivity:
The transducer’s sensitivity S is the slope of the straight line
Uout = f (IP), it must establish the relation:
Uout (IP) = UC/ 5 (S × IP + UO)

Offset with temperature:
The error of the offset in the operating temperature is thevariation of the offset in the temperature considered with theinitial offset at 25 °C.
The offset variation IO T is a maximum variation the offset in thetemperature range:
IO T = IO E max − IO E min

The output voltage noise is the result of the noise floor of theHall elements and the linear amplifier.

The offset drift TCIO E AV is the IO T value divided by thetemperature range.

Magnetic offset:

Sensitivity with temperature:

The magnetic offset is the consequence of an any current on
the primary side. It’s defined after a stated excursion of primarycurrent.

Linearity:
The maximum positive or negative discrepancy with a reference
straight line Uout = f (IP).
Unit: linearity (%) expressed with full scale of IP N.
Uout

The error of the sensitivity in the operating temperature is therelative variation of sensitivity with the temperature consideredwith the initial offset at 25 °C.
The sensitivity variation ST is the maximum variation (inppm or %) of the sensitivity in the temperature range:
ST = (Sensitivity max − Sensitivity min) / Sensitivity at 25 °C.
The sensitivity drift TCS AV is the ST value divided by thetemperature range. Deeper and detailed info available is ourLEM technical sales offices (www.lem.com).

Non linearity example

Offset voltage @ IP = 0 A:
The offset voltage is the output voltage when the primary current

Referencestraight lineis zero. The ideal value of UO is UC/ 2. So, the difference ofMax linearity error

IPLinearity variation in IP N

UO − UC/ 2 is called the total offset voltage error. This offset error
can be attributed to the electrical offset (due to the resolution of
the ASIC quiescent voltage trimming), the magnetic offset, thethermal drift and the thermal hysteresis. Deeper and detailed
info available is our LEM technical sales offices (www.lem.
com).

Environmental test specifications:
Refer to LEM GROUP test plan laboratory CO.11.11.515.0 with
“Tracking_Test Plan_Auto” sheet.
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LEM reserves the right to carry out modifications on its transducers,in order to improve them, without prior notice

LEM International SA
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HAH1BVW S/15

Environmental test specifications:

Refer to LEM GROUP test plan laboratory CO.11.11.515.0 with “Tracking_Test Plan_Auto” sheet.
NameStandard
CHARACTERIZATION @ 25 °C

Sensitivity / Accuracy / Total error

LEM 98.20.00.574.0

Offset / Electrical Offset / Magnetic Offset

LEM 98.20.00.573.0

Linearity error

LEM 98.20.00.370.0

Current Consumption

LEM 98.20.00.579.0

CHARACTERIZATION WITH T °C (initial)
Sensitivity / Accuracy / Total error

LEM 98.20.00.574.0

T °C variation of ... / Temperature Coefficient of S

LEM 98.20.00.574.0

Offset / Electrical Offset / Magnetic Offset

LEM 98.20.00.573.0

T °C variation of ... /Temperature Coefficient of Offset

LEM 98.20.00.573.0

Linearity error

LEM 98.20.00.370.0

Current Consumption

LEM 98.20.00.579.0

ELECTRICAL TESTS @ 25 °C
Dielectric withstand Voltage test

2500 V AC / 1 min / 50 Hz

Insulation resistance test

500 V DC, time = 60 s
RINS ≥ 500 MΩ Minimum

ENVIRONMENTAL TESTS (CLIMATIC)ISO 16750-4 § 5.3.2 (04/2010)
500 cycles (500 hours),

Thermal shock

30 min @ −40 °C // 30 min @ +125 °C
UC not connected, IP = 0

Steady state T °C Humidity bias life test

JESD 22-A101 (03/2009)

MECHANICAL TESTSISO 16750-3 § 4.1.2.4(12/2012)27.1 m/s2, 8 h/axe 10 Hz -1000 Hz

Vibration random in T °C

ISO 16750-3 § 4.2.2 (12/2012)
50 g/ 6 ms Half Sine @ 25 °C

Shocks

10 shocks of each direction (Total: 60)
UC not connected, IP = 0
IEC 60068-2-31§5.2: method 1 (05/2008)

Free Fall (Device not packaged)

FINAL CHARACTERIZATION
Characterization @ 25 °C
Characterization with temperature

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LEM reserves the right to carry out modifications on its transducers,in order to improve them, without prior notice

LEM International SA
Chemin des Aulx 81228 PLAN-LES-OUATES Switzerland
www.lem.com