´³ºÅÌ X üªõ@F
VPCgKXÉÎ·é X ü}U
äGV
½ª ]

v

|

ºÉ§§åwåw@¨¿w¤È§678_1297 ºÉ§ÔäSãS¬õs 3_2_1

Æ¯àtË¤SiNSRRCjäp

XvOGCgäpr[CItBX

1§679_5148 ºÉ§²pS²p¬õs 1_1_ñ¤ÂÈ X üñe«UÉæèCÉÀóÔºÌ¿ÉÎµÄLøÈv[uÅéd X üðp¢Ä¨¿ÌdqãNóÔðªè·é±ÆªÅ«éBÈ©ÅàCX ü}UÍàkdqÌãNðªè·éàÌÅCÚµ½´qÌñèLdqO¹ÌóÔ§xidq\¢jÉÖ·ém©ð^¦éB{eÅÍ³ºÉ¨¯é X ü}UÌªè@ÉÂ¢ÄðàµCdqóÔ©ç©éVPCgKXÌÇ\¢Ì³ÍÏ»Ì¤ÉÂ¢ÄÐî·éB1. Í¶ßÉ

é±ÆÉæè¨¿ÌGlM[óÔðvZ·é±ÆªÅ«
éB±êðtÉ¨¦éÆC\¢ð¼Úèµï¢¨¿iñ´³¨¿ÈwÉ¨¢ÄCPx X üð¶Ýo·úËõÍKvsÂÈc[Å»¿ÈÇjÌêCGlM[óÔðªè·é±ÆÅ\¢éB´³É¨¯é¨«Ì¤É¨«ðð«¾©·½ßÌLÍÈîñª¾çêéÆ¢¤±ðs·é½ßÉÍC¿ÉÎµÄ¢³ÍðÁ¦éKÆÉÈéB{eÅÍCX üªõ@ÌàÅà X üñe«UvªCÁÉ X ü}UiX­ray Raman Scattering: XRSjéB»Ì½ßC¿ÍTµÄeíÌÉüêçêÄ

¢éB»Ìæ¤ÈóµÉé¿ÉÎµÄC§ßÍÌ¢ðp¢½³ÍºÅÌ´³¨¿ÈwÉÂ¢ÄðàµC»

X üÍñíÉ«ÌÇ¢v[uÆÈé©ç¾BÀCÌpáÆµÄn¢EIÉ©Äà³Æ¢¤¼ð¥µ½r[Cª½­³ÍUN\¢Ï»ÉÂ¢ÄÌ¤ðÐîµ½¢B¨¿ÈwÉ¨¯éVPCgKXÌÌúËõ{ÝÉ¶ÝµÄ¢éB±êçÌr[CÅÍCñÜðp¢½\¢ðÍªå½é¤è@ÅÁ½Bµ

2. X üñe«U

©µßNÅÍC³Ü´ÜÈZpJ­ÌÊCñÜÈOÌªèª³»ÌêðÌ¨¿ÉÎµÄsíênßÄ¢éBá¨¿ÉüË³ê½ X üÌ½­Ízûé¢Íe«IÉ¦ÎCñ³Ì§ßæðA^CÉÏ@·éWIU³êéªC»ÌêÍñe«IÉU³êéBFig. 1OtBâ X üzûÊ©çñ³fÊð¾éRs

É X üñe«UÌTª}ð¦·BüË X üÆU X ü^[ÉgOtB[iCTjÈÇÉã\³êéC[WÌGlM[ðCv0, vfCgð k0, kf Æè`·êÎCO@CyÑ X üÌg·ðÏ¦Èªç¨¿ÆÌÝìpðªè·ézûÉ­õªõ@ÈÇÅéB

X üÍ102 `106 eV Æ¢¤L¢GlM[ÍÍÅè`³êÄ¢éªC±êÍàkdqÌ©GlM[©ç´qjÌGlM[ÉÎµÄ¢éBÊíCá¦Î104 eVÆ¢¤d X üÍC¯lÌGlM[xÌãNÉÂ¢ÄÌÇ¢v[uÅéBµ©µCÈºÅÚµ­q×éªCñe«Uðp¢éÆd X üðv[uÆµÈªçàÔOÉÂÉOõC»µÄî X üÉÎ·éiqU®âdqãNÉ·éGlM[óÔi10|3`102 eVj
ð²×é±ÆªÂ\ÅéB³çÉCñe«UÌêÍÚs^®Ê q ðp[^ÆÅ«é_ªéB¨¿àÅ¶¶é¨ßöÌGlM[óÔÍC»Ì¨¿Ì\¢ÉË¶µÄ¢éB±Ì½ßCæê´vZÅÍ\¢ð^¦

Fig. 1

Diagram of inelastic x­ray scattering: Incident photon has
energy hv0 and momentum k0, while scattered photon has
hvf and kf. Energy of Dv(v0|vf) and momentum ofqk0|kf are transferred to an excited particle (orparticles).

10  úËõ Jan. 2011 Vol.24 No.1
(C) 2011 The Japanese Society for Synchrotron Radiation Researchðà ¡ ´³ºÅÌ X üªõ@FVPCgKXÉÎ·é X ü}U

GlM[ Dv(v0 |vf ) Æ^®Ê qk0 |kf ªdqné¢ÍiqnÉÚs·éB±êðpµÄCeXÌU

èð¦·BÏªÎÛÆÈéUÉÖ^·édqª¼ÌdqÆÌÖª³­iêdqßjéÁèÌàkO¹dqÌpÅU X üÌGlM[XyNgðªè·é±ÆÝªãN³êéêCj ÉÂ¢ÄÌaðæéKvªÈ¢½ÉæèCGlM[Æ^®ÊÌÖÆµÄdqâiqÌã

ßCÌæ¤É«¼·±ÆªÅ«éBNóÔð²×éÌª X üñe«UªèÅéBêûÉ

X üñe«UÆ¢ÁÄàpÍ½íÅéªCñÂÌ

JeS[ÉåÊ³êéBêÂÍtHmªUiGl( )e 2 2 kfd 2s2

| f |e iqÉr|0r|2d(E0|Ef{Dv)f e0) q (eÉdEdV
mc 2 f k0

M[Æ^®ÊÌÖÈüjÌªèÉã\³êéñ¤Âñe
«UÅCà¤êÂÍÁè³fÌ¤ÂzûøÊðp·é±ÌUfÊÏð]¿·éÉ½èZq eiqÉr Ìæèµ¤Âñe«UiResonant Inelastic X­ray Scattering:¢ªâèÆÈÁÄ­éªCdqO¹¼aªå«È¿dqÌ

RIXSjÅ

éBXRS ÍCàÆàÆÍ X üñe«USÌðw·¾tÅ

Á½ªCßNÅÍdqãNðº¤ñ¤ÂãNÆÍá¢Càkdqðµ¤ XRS ÅÍCqrá1 ÅéÆ¢¤ßidCoÉqßjÌàÆÉ¨¢ÄCe iqÉr k1
Á½BæêÌ 1 ÍJñe«UCæè·`ÅÍàkdqðãN³¹éñ¤Âñ{iqr ÆµÄæèµ¤±ÆªåÅe«UÌ±Æðw·B{eÌåèÍC±Ì·`Ì XRSÚð±©È¢ÌÅÈ­ÆC±ÌßÌºÅ¾çêéUfÌpÅÊÏÍ X üzûfÊÏÆ`ÅéB¤Âñe«UêÊ1)¨æÑtHmãNÌªð\ñe«U2) ÉÂ¢ÄÍDê½ðàªé½ßCX üzûXyNgÆÌärðÊµ½c_ªÂ\ÅCXyNgÌ`éÌÅQÆ¸«½óÍàkdqªÚéñèLdqO¹Ì¤¿dCoÉqJÚ

¢BÜ½C¯lÈtHgC\tHgAEgªèÆµÉæèe³êÄ¢éªóÔ§xi½¾µàkóEÌe

Ä X ü­õªõiX­ray Emission Spectrosocpy: XESjª¿ðl¶µ½àÌjÉÎ·éBµ©µÈªçCÀÛÌªéBXES Éàñ¤ÂÆ¤Â­õªõiRXESjªèÉ¨¢ÄK¸µà±ÌßÍ¬§µÈ¢BÁÉ³¿è¤É³¤Ép·é±ÆªÅ«éª3)C»êçÉÍ¡ÉÎ·éªèÅÍÀ±ãÌ§ñª½­CoÉqßª¬èñÍGêÈ¢B­õÍñe«UÆ{¿IÉÙÈéàÌÅ

§ÂðÅÌªèðs¦È¢êª½¢©ç¾B»±ÅC

éªC¤ÂóÔÅÍ¼ÒÌ¾mÈæÊªïµ­ÈéB^®ÊÏ»ðl¶µ½ X ü}UXyNgÌ_

RIXS Æ RXES Æ¢¤PêªµÎµÎ¯`Ìæ¤Ép¢IÈLqðs¤ÝªKvÆÈéBoÉqßÅÍ qrá1çêÄ¢éÌÍ»Ì½ßÅÌðÌºÅwðxLÖÆWJ·é±ÆÅ]¿µéB

U_ð¨³ç¢µÄÝæ¤Bñe«UfÊÏÍC

½B±êÉÎµÄCßN Soininen Í

Ê²aÖðp

4) B±êÉæèCoÉqÖ§JÚ¤ÂøÊª¾çêÈ¢ðºÅÍC2 õqßöÌn~g¢½WJðñÄµÄ¢éjA H2 ðp¢ÄÌæ¤ÉLq³êéB

ðÜÞ·×ÄÌJÚðl¶Éüê½V~

[VªÂ\ÆÈéB±ÌvZû@Í»Ý Fe R[h5)ÉÌp³êÄ
H2

¨è C^®Ê Ï»ÌË¶ «ðæèüê ½LøU U

2ed(r|rj)A(r)ÉA(r)2mc 2
jifeff (q, vjjðvZ·é±ÆªÅ«é½ßCqrZ1 Åªè

d 2s
L6
k 2f |q f|H2|0r|2d(E0|Ef{Dv) 2 2dEdV c (2p)2f±±Å e, m, c, Í»ê¼êdCfÊCdqÌÃ~¿ÊCõ¬CvNèÅ

³ê½ XRS XyNgÉÎ·é EXAFS ðÍà¡ãÌ­WªúÒ³êéB

3. ³¿ÉÎ·é X ü}UªèéBrj ÍÀóÔÉ¨¯édqÌÀ
éBE0 Æ Ef Í±±ÅÍCÀÛÌ³ºÌ XRS ªèÉÂ¢Äðà·îêóÔ |0r¨æÑãNóÔ | f rÌdqnÌGlM[ÅéBêÊIÈðàÍÈOÉ³êÄ¢éÌÅCQl¶£6)ð

Wð

½¦éBÜ½CL3 ÍnÌÌÏÅ

éBÜ½CA ÍxNg|eVÅ

²¢½¾«½¢i±êÉÍOÍÅ¦µ½U_ÉÂ¢èCÄÌà¾à©êÄ¢éjBXRS Í(v) {e a e {e a eA(r)cL|3/2
ks

1/2

k

s

ks

ikÉr

õ
s ks

|ikÉr

}

Úµ½´qÌ 3 ³IÇ\¢ð²×é½ßÉñíÉLøÈèiÅ

éÆ¤

ÉCgp·é X üÍ³fÌÁ«zû[GlM[ÉçêÈ¢Æ¢¤Á¥ðÂBÁ«zû[ªS eV Æ¢¤îÅ^¦çêéB±±ÅCr ÍÀóÔÉ¨¯éÀWCes Íõ

X üÌæÉqÌÎõxNgCk ÍõqÌgCaks Æ aõks ÍõqÌÁ

·é±Æðl¦æ¤Bî X üÌ¨¿ÆÌÝìpÍµÅ¨æÑ¶¬ZqÅ

èC±Ì\»ÍêÊIÈñe«U­C~NÌL@ÉÅ³¦àµ­zûð¤¯é X ü}UÍéBî X üÀ±Íî{IÉõ¹©ç¿ÜÅÈµÌ

ÉKp³êéB{eÌe[}ÅàkdqÉæé X üÌUÅ

é³fÉÎµÄ X üzûXyNgðªèèCUfÊÏÍCDv^óªOñÆÈÁÄ¢éB±Ì±Æª³ºÌy³fÌzªàkdqÌ©GlM[ßTÉ¨¢Ä}È§¿ãªû[ªèðÀ¿sÂ\ÉµÄ«½ªCXRS ðg¦Îd X

úËõ Jan. 2011 Vol.24 No.1  11üðv[uÆµÄzû[Ì\¢ðªè·é±ÆªÅ«±ÅÍ³çÉ¬³Èr[ªv³êéB»±Å FM ÆéBæÉq×½Æ¨èC§ßÍÌ¢d X üÍ³Í­¶¿ÆÔÉ Kirkpatric­Baez ~[iKBjðÝu·é±uàÌ¿ÉÎµ«ÌÇ¢v[uÅèCÁÉy³ÆÅC¼lSÅ20~20 mm2 öxÌr[TCYª¾çfðÎÛÆµ½³¨¿ÈwÉ¨¯é XRS ÌLp«ÍÈêÄ¢é7)BU X üÍCêÂÜ½Í¡iÊíÍcÉz

OæèwE³êÄ¢½Bµ©µÈªçpÉ

ñµ½ 3 ÂjÌ½ÁÄÍÀÊpÈ»iAiCUjÉæèªõ±ãÌâè©çßNÜÅsíêÄÍ¢È©Á½B³Z

³ê½

ðÑÊ³¹àÌ¿ðÆË·éÆCZ©çÌUÍ

XRS ÅÍU X üÅÍÈ­üËGlM[ðXL·ÆCSi ÅÌoíÉæèJEg³êéBÊí

¿©çÌUæèÍé©Éå«­Co·×«VOiÉéB¡éAiCUæèàmN[^ÅGlÎµobNOhª³|IÉå«­ÈéBv¦ª 1

M[XLðs¤Ù¤ªeÕ¾©çÅHz öxµ©È¢³ XRS ªèÉ¨¢ÄC¢obOO

ÄCDCMCCM ÌãÉ`lJbgªð\mN

EhÍv½IÅ

éBâèÍC¢©ÉµÄUfÊÏÌ¬³³Æ÷¬¿ÌÏÉNö·éã¢VOið¾é©
Å

èC¾¢·¦éÆobNOEhðæèá­µ½ðÅæè­¢VOiðªè·éi¢ S/N äð¾éjéBKvÉ¶[^iHRMjðÝuµCGlM[ð0.1 eV öxÉÜÅié±ÆàÂ\Åðp¢

éB_ChÚqiPRj½Îõ©ç¼Îõé¢Í~ÎõÉàÏ·Å«é½ßCzû@Æ¯lÉP»¿ðp¢êÎÎõ_»Æ¢¤±ÆÉs«éB½Æ¦JEg[gª 1 Hz öxûÊË¶«ðC¥êÆ¤Ép¢êÎ¥C~ñF«ðpµÅà S/N äª¯êÎC·Ôªèð±¯³¦·êÎL½ªèðs¤±ÆàÂ\ÅéBÓ`Èf[^ª¾çêéBµ©µ S/N äªá¯êÎCÊpÈ»Íñe« X üUÌªÍ»ÆµÄæ­

ú±¯ÄàLpÈf[^ÉÈçÈ¢B³ºÌ¨¿ÌêgíêéªC»êÉÂ¢Äv_ðÌ×Ä¨«½¢Bub

C³ÍÍÊÏÉ½äá·é½ßC¿ÌÏð X üÌNOÌñÜðð÷ªµÄ¾çêé®iDE/EDu/tan uBj

ü·ªe·éÜÅå«­·éÆ¢¤óÉÍ¢©È¢B±

ÍÌ±ÆðÓ¡µÄ¢éBêÉÎ·éð@à¥Ü¦ÂÂCÀ±ãÌZpÊÉÂ¢

@
ò

A
ò

ªèn

Fig. 2 ÉÍ³º X ü}UpÌªènÌêáÆµé¢Í¿

xANZv^XÉæèÜé Du Éäá·éÇjÌ¼Ê©çq×éB

3.1

GlM[ªð\ÍCX üÌ­UpãÌLÀÌr[TCYÌô½wIøÊÆ»ÌpÄCªènir[CjÆ¿Â«i³­¶uÈuB ¨90ÌÆ« Du Ìñ^ÍÅ¬ÆÈèCªð\ÍÅÆÈé»Ì½ßCüËGlM[ÉCÓ«Ìéñ¤Âñe«UÄ SPring­8 äpr[C BL12XU ÌõwnÆñe«jÅgp·éÌªÅÍoé¾¯wÊ½Ëi2uB `180

XyNg[^ð¦µ½B¡â XRS ÌÝÈç¸³êÊIÅ¿ÉÎ·éPF X üðp¢½ªèÉÆÁÄPxAW¢§ÌpÅ¯¶ uB ðÛÂ±ÆªÅ«éB»êä¦_õ¹

[^õ¹ÍsÂÈ¶ÝÆÈÁÄ¢éBõ¹æètËÆÝÈ¹é¾¯üËõðWõµCU­xðÒ®½ßÉå

éBÊpÈ»ÍC_õ¹ð¼è·êÎCL³ê½úËõÍ Si111ñ»mN[^iDCMjÉÊÏi`100 mmFjÌ

æèPF»³êéBPF»³ê½úËõÍCSi Ü½Í PtÄoé¾¯½À×éBmeV NXÌªð\ñe«ÊpÈªÍ»ðCÊÉÁR[VÉ~[iCMjÉæè²gð³ê

UpÌªõíà±Ì´ÉîÃ¢Ä¢éB³çÉwÊ½

½

ËzuÆ

ÆCPt Wõ~[iFMjÉæèC¿ÊuÅ80(v)~120(h) mm2 iFWHMjÖÆWõ³êéB½­Ì³ÀÊpÈ»Ì«Ìæ¢Æ±ëÍCFig. 2 Ì

¼²iªU²jÆ

½²iTW^²jÌWõ_ªêv

Fig. 2 Optics of Taiwan IXS beamline, BL12XU at SPring­8. DCM: silicon 111 double crystal monochromator, CM:
silicon (or platinum) collimating mirror, HRM: high­resolution monochromator using silicon 400 (220 or 333)
channel­cut crystals, PR: diamond 220 phase retarder, FM: platinum focusing mirror, KB: Karkpatric­Baez
mirror.

12  úËõ Jan. 2011 Vol.24 No.1

ðà ¡ ´³ºÅÌ X üªõ@FVPCgKXÉÎ·é X ü}U·é½ßCoíÌÊÏðÅ¬»i`2~2 mm2jÅ«éBêÊÌ uB ÅÍC¼ÒÍêv¹¸CWõ_Í¢¸ê©ÌûüÉLÑé±ÆÉÈéBoÊÏÌÅ¬»ÍobNOháºÌ½ßÉÍP©ÂLøÈèiÅ

èCªèÌJE

g[gª 1 Hz öxµ©È¢³ XRS ªèÉÍdv
Å

éB
ÌÉÀ
ãûUªÍ»ÌGlM[ªð\ð uB¨90Å^¦éÌÍC®ÍwñÜ_ª½¦é_[EBÅéªC±êÍ X üGlM[ªãªéÉÂêÄC}
É¸­·éB·xöqÉàæéªC½Æ¦ÎC9.9 keV
iSi555½ËCu88jÅÍ`15 meV ÅéªC22 keViSi 11 11 11½ËCu88jÅÍ1 meV Å

éB±êª

meV NXÌªð\ñe«UÅÍ20 keV öxÌ X
üªp¢çêÄ¢éRÅéBªð\ªãªêÎC»Ìª½Ë­xÍã­ÈéBÉà©©íç¸ªð\ñe«Uª»ÀÉtHmªUªèÌc[ÆµÄm§µÄ¢éÌÍCªèÎÛªtHmÅèC»êÍdqãNÉä×

102 `103 {à­¢U­xðÂ½ßÅ
ðÎÛÆµ½êC{ÅéBdqãN

êÎ10 keV öxÌ X üðp

Fig. 3Inelastic X­ray scattering spectra from diamond anvil cells
and their dependence on the incident energy and the scatter­ing angle. There are mainly contributions from the Compton
scattering or scattering due to plasmons. The inelastic scat­tering band appears at higher energy loss region with increas­
ing the incident X­ray energy or the scattering angle. Black
arrows indicate specic edge positions of elements in an XRS
spectrum.

¢CmN[^ÌGlM[àÜßÄC0.1`1 eV
ÌGlM[ªð\ÅÀ±ðs¤ÌªÅà»ÀIÅ ë¤Bµ©µêûÅ³ XRS ÅÍ¢§ß\ÍðàÂ20
keV Ì X üpÉÎ·év]ªP ¿ÈO©çÌUÆòQ Rv
XRS ohÉÎµÄCòéB»ÀIÈv¦C

gUÌñ^ªåÈobNOEh¹ÆÈéB³À

ÂÜè»ÀIÈ_[EBðÛÂ½ßÉÍCªõíÆµ±ÅÍC¿ÈOÌ¨¿ÌÌÏÍ¿Éä×Ä³|IÉåÄáp½Ë u30ðpµÈ­ÄÍÈçÈ¢Bµ©µC«­C»ê©çÌUà³|IÆÈéBÜ½CRvg

»êÅÍùÉq×½Æ¨è tan uB ª¬³­ÈéªCDu Ì

UÍ XRS æèà¸ÁÆ­xª­¢½ßC±êç 2 ÂÍñ^ªå«­Èèªð\ªáº·éBÜ½CoíÌÊÏ

P ÍüË X üÆµñíÉ¢obNOEhÆÈéBò

ªå«­ÈèobNOhªÁ·éB³çÉÍGl

Ä}CNr[ðp¢½èC¿ÆªÍ»ÌÔÉXM[ X üÉÎµÄoífqª Si ÅÍoø¦ªs\

bgðzµ½è·é±ÆÉæè¸ºçêéB}CNr[ªÅCCdTe ÈÇÌzûWÌ¢d³fªKvÆÈéÈ

CXbgVXeÌzuÍdvÅ

Ç·×«ÛèÍ½¢BÌ¨¿©ç¾¯ÅÍÈ­¿RÌàÌª½ªÉ

é½ßCXbgVXeÅ·é±ÆÍsÂ\Å

éB½

3.2

¿Â«

¾µCRvgUÌvt@CÍüËüÌGl³À±ðs¤½ßÉÍC¿ð³Í}ÌÉz·éKvªQ Í¿ÈO
éBòéB­¢VOið¾é½ßÉÍCp¢é X üÌGlM[ðKØÉIð·é±Æ©çnÜéBXRS ÉÍ

M[ÆUpÆÉË¶·é½ßC±êçðKØÉIð·é±ÆÉæèCÚ·éGlM[ÚsÌæÉ¨¯éRvgRÌobNOEhð¸ç·±ÆªÅ«éBFig.

d X üðgpÅ«éÆq×½BGlM[Ì X üðü

3 ÍüË X üGlM[ÆUpðÏ¦ÄÀÛÉªèµ½Ë·é±ÆÉæèC¿ÖÆÍ­tHgªÁ·é¾

XyNgÅ¯ÅÈ­C_IÉÍæèGlM[ÌüË X üðpÈéÉÂêÄC»êéRvgUÌs[NÊuÌGl

¢êÎUfÊÏÍÁ·éBÜ½CX üNü·ªå«M[ÚsÊªå«­Èé±Æª©ÄæêéB

éBüËGlM[é¢ÍUpª­­ÈéÌÅCÌÏøÊÉæéU­xÌÁªúÒ³êªèÎÛÆÈé³fÉÂ¢ÄïÌIÉl¦ÄÝæ¤B±

éBµ©µÈªçÍ»¤PÅÍÈ¢Bá¦ÎCOqµêÜÅ³ºÅÍC_ChArZiDACj½GlM[ÌæÉ¨¯éªÍ»Ì½Ë¦áºâCð³Í­¶uÆµÄp¢é±ÆÅCB2O38)CH2O9_11) C³¿ðNü·öxÉå«­æé±ÆªÅ«È¢Æ¢¤x[12)CC6013)CO214)ÈÇÉÂ¢ÄC{CYfC

RÌ½ßCVOiÌ­xª¬³­ÈÁÄµÜ¤ÈÇC}_ f Ì K z û [ É Ö · é XRS ª è ª s í ê Ä ¢ é BCiXÊà¶Ý·éBSi Ì hhh wÊ½ËðªÍ»ÆµDAC ÍCKXPbgiÊíÍà®»jÉÄp¢½êÉÂ¢Äl¦½ÈçÎC»ÀIÈIðÍC

ðüêC»êð_ChÌæ[Å²ÝC½Î¤ÉÍð

9.9 keViSi555jÆ13.8 keViSi777jÌ¢¸ê©ÅÉobNOEhð}¦éû@ÅéB

éBªèµ½¢¯½É¿

Á¦é±ÆÅ¿ðÁ³·éuÅiFig. 4a QÆjCRpNgÅ

é½ßlXÈªèuÆ¤Ép¢é±ÆªeÕúËõ Jan. 2011 Vol.24 No.1  13

ñ110 eV ÆVRÌ L [Éß­C|XgGbWÌ÷×
\¢ðªè·éêÉ¨¢ÄxE©çÌVOiÆdÈé½ßCxEÌgpÍKØÅÍÈ¢æ¤Évíêéi½¾µCvGbWßTÌ\¢ðc_µ½¢êÉCxEKXPbgÅªèªsÂ\¾ÆmFµ½í
¯ÅÍÈ¢jBãÄÆµÄÍC³Ü´ÜÈªèÅêÊIÉ
p¢çêéæ¤È_ChðÊµ½û@ªéiFig.

4a ¨æÑ cjB³ÅÍArÌÔuª·­Èé½ß_Ch©çÌüËÅÍ¿ÌUÌÏª¬³­ÈéÆ¢¤ï_ÍéªCªèÍÂ\ÅéBæ­p¢çêÄ¢éüË X üGlM[iñ10 keVjÆUpiñ30xj
ÌêCVR L [ÌGlM[ÌæÅÍRvg
UÌñ^ªå«­ÈéBRvgvt@CÍU
Fig. 4(a) Schematics of a diamond anvil cell (DAC) and possible
incident beam directions (red arrows). A sample in a DAC(yellow) is usually a disc­shaped plate. The plate is parallel
to culets of diamonds. Generally, the diameter of a sample
disc is a few times larger than its thickness. (b) Throughgasket conguration: The incident and scattering X rays go
through a gasket made of usually beryllium. A sample disc islocated in the scattering plane. Therefore, scattering volume
is governed by the sample diameter. (c) Through diamondconguration: The incident and scattering X rays go throughone of the diamond and the directions are nearly normal to asample disc. Therefore, the scattering volume is governed by
the sample thickness.

pÆGlM[ªå«­ÈéÉÂêGlM[¤ÖÆVtg·éÌÅCððI×ÎVR L [ÌÌæÌob
NOEhðº°ärI S/N äÌ¢XyNgð¾
é±ÆªÂ\ÆÈéiFig. 3jB

4. ¤áFVPCgKXÌ\¢Ï»±±ÅCXRS Ì´³¨¿ÈwÖÌKpáÆµÄCVPCgKXÌ\¢Ï»ÉÂ¢ÄÌ¤ðÐîµ½¢BnàÍåGcÉnkÉ}gÉjÆ¢¤wó\¢ðµÄ¨èCnk¨æÑ}gÌåv\¬¨¿ÍPC_ÅéB³ºÅÌ X üzûªõ@ÅÍCSÌ K [ÉÎ·éªèÍªèáªéàÌÌ15) C»êæèày¢³f

ÅÍñíÉïµ­ÈéBæÁÄæ 2 üú³fÆæ 3 üú
³fª XRS Ìå½éÎÛÆÈéBæ 2 üú³fðÎÛÆ

iVPCgjÅ

éÆ³êÄ¢éB±êçð\¬·é³

fä¦Í½¢É_fCVRC}OlVEcÆÈÁÄ¢éBnà\¢ÍCn`¬ÌúiKÉ¨¢Än\Êð¢ÁÄ¢½VPCgÌoZÌi}O}I[V·éêCxE»ÌKXPbgðÊµÄªè·éÌjÅ³fªÊªN±Á½ÊÅ

ªæ¢BÜ¸xEÍåCÅÀèÈÅÌÌÈ©Å´é16) B±Ì}O}I[VÍ[³2000 km ÉÜÅBµéÆl¦çêÄ¢qÔªÅà¬³¢½ßCX üÌ§ß¦ª¢BÜ½C

Ä¢½Æà¢íêÄ¨èC»ÌÅÌ³fªÊÉÂ¢Ä

DAC àÌ¿`ó©çª©ÁÄ¢½¾¯éÆv¤ªiFig.

ð·é½ßÉÍCVPCgoZÌª}O}I[VÌ

4a ¨æÑ bjCUÉÖ^·é¿ÌæðL­æé±Æª·x³ÍðÅ¦·¨»wÁ«ªdvÈîñÆÈéB¨Å«éB±êç 2 ÂÌR©ç S/N äð­·é±Æª¿Ì«¿Í\¢Æ§ÚÉÑÂ¢Ä¢é±Æ©çCVP

Å«éBÜ½xEÌ K [Í`EÌ K [©ç50CgoZÌª·³ºÅÇÌæ¤È\¢ðÆéÌ©ÉÍeV ¢Æ±ëÉ

èCÌ{ÆÍ80 eV à£êÄ¢ñíÉ»¡ª½êÄ¢éBµ©µÈªçCPC_ÌZé½ßCxEÌ XRS ÍCxEð¿ÆµÈ_ Í í ³ Å à ñ í É  ­ i á ¦ Î SiO2 Å 1986 K C¢ÀèCæ 2 üú³fÌ XRS ªèÉÛµÄv½IÈob

MgSiO3 Å1833 KjCÁ³ÉæèZ_Í³çÉã¸·é½

NOEhÆÍÈçÈ¢BRvgUÉÂ¢ÄàC

ßC±Ìæ¤È´·óÔÅÌVPCgoZÌÌ»Ìê{æèd¢³fÅ

Ï@ÍñíÉ¢ïÅêÎCUpªá¢êÉÍå«ÆµÄÌKXð¿Æµ½¤ª·ñÉsíêÄ¢éBÈâèÆÈçÈ¢B
æ 3 üú³fÌêÍ­XïîÅéBæÁÄCoZÌÌAiO¨¿éBVRÉÂg¬ªP©ÂKXª¾çêâ·¢nÆµÄ SiO2 Æ¢Äl¦ÄÝæ¤BK [iDE1839 eVjÆ L [iDE

MgSiO3 ª

99 eVjÌ 2 ÂÌzû[ªªèÎÛÆÈè¤éBµ©µ K¨æÑ»Ì³ÍUNñ»¿»Æ¢¤Ê©ç¨¿ÈwIÉ[Ì XRS ohÌ­xÍñíÉã¢½ßC¿ÌÏª¬àÚ³êÄ¢é¨¿Å³¢³À±Ìê L [Ìªèðs¤Ù¤ª»ÀIÅ

C_Ìåv³fÌ¤¿ãÊ 3 ÂðÜÞ MgSiO3 KXéB³ºÅÌ XRS ªèÉ¨¢ÄxEKXPbg

ÉCæè»¡ªà½êÄ¢éBêÊÉKXÌ\¢Ï»éBSiO2 KXÍñ»¿Ì³ÍUN\¢Ï»éBêûÅnÈwIÉÍCPðgp·ébgÍæ 2 üú³fÌêÅq×½ªC

ÍC»Ì\¢Ï»ÆÌär©çCSiO4 lÊÌª`¬·VR L [ XRS ªèÉ¨¢ÄÍxEÌ K [ª

é 3 ³ÔÚ\¢ªÔÌ½¢óÔ©ç¬³¢óÔÖÆ

14  úËõ Jan. 2011 Vol.24 No.1

ðà ¡ ´³ºÅÌ X üªõ@FVPCgKXÉÎ·é X ü}U

Fig. 5Structures of SiO2 (a: quartz (Qz), b: stishovite (St)) andMgSiO3 (c: orthoenstatite (OEn), d: perovskite­type
MgSiO3 (Pv)) polymorphs. Red, blue, and orange balls in­dicate oxygen, silicon, and magnesium atoms, respectively.
Low pressure phases (Qz and OEn) consist of SiO4 tetra­
hedra whereas high pressure phases (St and Pv) are made up
of SiO6 octahedra. Each SiO4 tetrahedron connects to fourothers in Qz whereas to two in OEn. The structure of St ap­
pears to consist of edge­sheared SiO6 chains. A three­dimen­
sional network structure by corner sheared SiO6 octahedra isseen in Pv.
Fig. 6

Ï»µC»Ìã SiO6 ªÊÌðjbgÆ·é\¢ÖÆÏ»·éÆl¦çêÄ¢éB±êçÌ\¢Ï»ÍTµÄÂtIÅèC»ÌêðÅÌÏ@ÉªèªK{ÅéBFig.

5 É SiO2 ¨æÑ MgSiO3 Ì»\¢ð¦·Bí³ÅÀèÈÎpiQzj¨æÑÎûPÎiOEnjÍ SiO4 jbgðXRS spectra of the oxygen K edge in compressed SiO2 glass.
The spectra between 1 GPa and 14 GPa is an intense peak lo­cated at around 538 eV (labeled as Q), which is a prominent
feature in the XRS spectrum of quartz. An additional, in­tense peak appears at around 544 eV at pressures above 19
GPa (labeled as S). The spectrum at 3 GPa was collectedfrom the sample quenched from `45 GPa. (J. F. Lin et al.
21): Copyright (2008) American Physical Society)\¢ÉÂªC·³ÅÀèÆÈéXeBVoCg¨ æ Ñ y  t X J C g ^ MgSiO3 Í SiO6  j b g ð ¢Í13.8 keV ªp¢çê½B

ÂBKXÅà¯lÌV[PXÅ\¢ªÏ»·éÆl¦SiO2 KXÌ_f K [ XRS XyNgÌ³ÍÏ»ðçêÄ¢éªCÀiÎÌ«Éæé©ªÈ¢½ßCÔI

Fig. 6 ÉVR L [XyNgð Fig. 7 É¦·BKX

È\¢ª»êéÈÇÌá_ª¶Ý·éÆl¦çêéBÌ XRS XyNgÌðßÍ SiO2 Ì»ÅéÎpÆßÌ¤ÉæèCSiO2 KXÌ\¢ª10_50 GPa Ì

XeBVoCgÅ¾çê½XyNgÆÌärÉæès

³ÍÍÍÉ¨¢ÄÏ»·é±Æª[U[}ªõCÔíê½B_f K [XyNgÍí³ÅÍÎpÉÁ¥IÈOzûªõCX üñÜÌªèÉæèª©ÁÄ¢é17_19) B

s[NiFig. 6  Qjð¦·ªC19 GPa ÅÍXeBVo»ÌÏ»ÆµÄÍ SiO4 jbg©çÈé½õÂÌgÝÖ

CgÉÁ¥IÈs[Ni¯ Sjª°ÆÈÁÄ¢éBêû¦âVRÌzÊÌ 4 ©ç 6 ÖÌÁÈÇªñÄ³

ÅVR L [XyNgÅÍ40 GPa É¨¢ÄàXeB

êÄ¢éªCRZTXÍ¾çêÄ¨ç¸CÏ»ªN±

VoCg^ÌÁ¥iFig. 7 Â_üjð¦³È¢BÜ½

é³ÍÉÂ¢Äàc_Ì]nªc³êÄ¢½B±ÌâèÉÎp^Æàá±ÙÈéÁ¥ð¦µÄ¢éæ¤ÅÎµÄdq\¢ÉÇ\¢Æ¢¤_©çVµ¢îñð^KXÌ XRS XyNgððß·é½ßÉÀ±I¨æÑéBSiO2¦é½ßÉCí³ºÅÀèÈ SiO2 »½`Æ³ÍºÉ

_IÉñÄ³êÄ¢é»\¢ÉîÃ¢½ñèLdqO

é SiO2 KXÉÎµÄ_f K [ÆVR L [ÉÖ·¹ÌóÔ§xÌæê´vZªsíê½20) BÚµ­à¾

é XRS ªèª APS Ì13_IDD Æ16_IDDC¨æÑ SPring­ÍµÈ¢ªCvZÉæè¾çê½óÔ§xðXyNgÆ

8 BL12XU É¨¢Äsíê½20_22) BKXÉÂ¢ÄÌªär·éÛCGlM[Ì´_izû[ÆtF~GlèÅÍC³­¶uÆµÄÍ DAC ðgpµC_f K

M[ÆÌ·C[ÍxEKXPbgðÊµÄCVR L [Í_éB_fÌêÍÌL¢Á¥IÈ\¢ª¾çêé½ß

ChðÊµÄªè³ê½BU X üGlM[Æs[NÌÊuÍ»êÙÇâèÆÈç¸ärÍeÕÅ

é¢ÍJÚGlM[jÌèÉâèªéµÄÍC_f K [ÉÎµÄÍCAPS ÅÍ9.7 keVCSPr­ªCVRÌêÍ\¢ÉÁ¥ªRµ­s[NÌÊuªing­8 ÅÍ9.9 keV ªCVR L [ÉÂ¢ÄÍ13.3

âèÉÈé½ßCXRS XyNgÆdqóÔ§xÆÌäéúËõ Jan. 2011 Vol.24 No.1  15

Fig. 7

XRS spectra of the silicon L edge for SiO2 glass under highpressure. The thin lines are smoothed curves by the threepoints binning to guide the eyes. Those of quartz (red/solid)
and stishovite (blue/dotted) shown are also shown with each
spectrum for comparison.(H. Fukui et al.22): Copyright(2009) American Physical Society)rÍïµ¢B_IÉñÄ³êÄ¢é³NXgoC
giSiO4 lÊÌð\¢jbgÆ·é)23)Æy^ SiO2
i5 zÊÌVRÆ 2 zÊ¨æÑ 3 zÊÌ_f©çÈé)24)ÉÂ¢ÄdqóÔðvZµ½Æ±ëC¼ÒÆà_fÌdq\¢ÍXeBVoCg^ð¦µ½B±êÉæèC
_fÌdq\¢ªÎp^©çXeBVoCg^ÖÆÏ»·é½ßÍzÊÁÌKvÍÈ­CSi_O_Si pÌå«È¸­iñ135xÈºÆª³êéjÉæèÂ\Åé

Fig. 8XRS spectra of the oxygen K edge for MgSiO3 glass. Gray
area represents energy range from 539 to 549 eV, where theintensity goes up with increasing pressure. (S. K. Lee et al.
26): Copyright (2008) National Academy of Sciences,
U.S.A)±Æª¾ç©ÆÈÁ½BêûVRÉÂ¢ÄÍCæÉq
×½âè_ªé½ßCvZ³ê½óÔ§x©çmèIÈ

§ñð¾éÉÍçÈ©Á½ªCÐÆÂÌÂ\«ÆµÄ 5¢ÉÏ»ª¶¶Ä¢é±Æð¾ç©Éµ½iFig. 8)26)BÞ

zÊVRÌ`¬ªñÄ³ê½22)BßN SiO2 KXÌÍ±ÌÏ»ª_fÌgNX^[i3 ÂÌVRª

X üñÜÀ±¨æÑ§xªèªæè¸§ÉsíêC»ÌzÊµ½_fjÌ`¬ðÓ¡µÄ¢éÆ_¶Ä¢éBÂ¢Ê©çÍñ40`45 GPa É¨¢ÄVRª 6 zÊÆÈ

ÅßC±Ì¨¿ÉÂ¢ÄVR¨æÑ}OlVEÌ LÁÄ¢éÆ¢¤ñªÈ³ê½25) B±Ì X üñÜÌÊ[Ì XRS ªèªsíê½27)B±êÉæèCVRÌdðl¶·éÆC45 GPa ÈãÌ³ SiO2 KXÅÍVR

qóÔÏ»Í_fÌdqóÔªÏ»·é³ÍÅÏ»·éÆÍ 6 ÂÌ_fÉzÊ³êÄÍ¢éªC¯¶­ 6 zÊV¢¤CSiO2 KXÆÍÙÈÁ½Êª¾çê½B»Ì´

RðÜÞXeBVoCgÆÍÙÈédqóÔÉÈÁ

öÍCMgSiO3 ÌêÍC}OlVEÌ¶ÝÉæè SiO6Ä¢é±Æªª©éB³ SiO2 KXÌÚ×È\¢Í¢ªÊÌª`¬³ê½êÅàärIê½\¢ªæèâ·éªCÅ¤LµÈ¢ SiO6 ª½­¶ÝµÄ¢é¢½ßÅÍÈ¢©Æl¦çêéiFig. 5 QÆj
BÜ½C}O¾s¾Å

Æ©CSiO6 ª³ªÊÎ©çå«­cñ¾`ÉÈÁÄ¢élVEÌXyNgÅÍ_fâVRÌXyNgÏÆ\ª³êéB¢¸êÉ¹æCXRS XyNgÉæè¾»Éæ§ÁÄÏ»ª©çê½B±êÍCá³ÅÌ³k®

çê½dqóÔªCKX\¢fÌÃ«ð]¿·é

ª Si_O_Si pxÌ¸­ÈÇÉæé}OlVETCgÌdvÈwWÆÈé±ÆÍÔá¢È¢B³kÅ

Lee çÍ_f K [ÉÂ¢ÄÌ XRS ªèð MgSiO3 KXÉÂ¢Äs¢C12`20 GPa Ì³ÍÍÍÅ_fÌdq\16  úËõ Jan. 2011 Vol.24 No.1

éÆ¢¤]Ìl¦ûÆ²aIÅéBðà ¡ ´³ºÅÌ X üªõ@FVPCgKXÉÎ·é X ü}U

5. IíèÉ

ÉÎµÄv«ÌÇ¢XyNgð¾é½ßÉÍúÌIõªKvÅ

X ü }  U Í U  ­ xª ñ í É ¬³ ¢ ß öÅéB¡ãXÈéÉÀóÔiá¦Î50 GPaC

5000 KjÅÌªèðl¦éÆCúÍ»¤¢Á½óÔð

èC÷¬¿µ©pÓÌÅ«È¢´³¿ÉÎµÄKpÀèIÉÛ·éÉÍ··¬é´ª·éÌÍñíÉïµ¢ªCj[NÈîñð^¦éÀ±èÉÀðºÅÌªèðs¤½ßÉàCXÈéPxÉ@ÅtbNXðÂd X ü¹ÌJ­ðØÉè¢C{eÌé±ÆÍª©ÁÄ¢½¾¯½ÆúÒ·éB¡ãC

XRS ðpµ½\¢¤âdqóÔ¤ÍÇÌæ¤ÉW
JµÄ¢­Ì¾ë¤©B{eÅÐîµ½¤ÎÛÅÑÆµ½¢BéVPCgKXÍCVPCgoZÌÌAiO¨¿ÆµÄÌ¤ÊªéB¡ãCXÈé¡

é±ÆÍq×½BæÁÄC¡ãÍoZÌðÎ

Ó«{¤É¨¢ÄCNSRRC Ì Yong Q. Cai mi»ÝÍÛÆµ½ªèÖÌWJªúÒ³êéªCæÉq×½Æ¨è

Brookhaven National Lab.j¨æÑªRåwÌ_è³ü³´·ððÀ»³¹È¯êÎÈçÈ¢BÜ½CXRS ÉöÉÍåÏ¨¢bÉÈèÜµ½BÜ½{eðÜÆßé@ïà»êé¥C~ñF«ðpµ½ªèà»¡[¢B±êðð^¦Ä­¾³Á½ÒWÏõïÉ´Ó¢½µÜ·BÀ»·é½ßÉÍÜ¸³á·¥êÌ­¶ðsíÈ¯êQl¶£ÎÈçÈ¢BXRS XyNg[^ãÅ¡ÉÀóÔð
ÀèÉ­¶³¹éuÌJ­ªKvÆÈë¤B
XRS XyNg©çæèÍÁ«èÆµ½îñð¾é½
ßÉÍCf¨¿ðp¢½_vZÉæéXyNgÆÌärªñíÉLøÅ

éÆMÒÍl¦éBX üzûXyNgðvZ·é½ßÌæê´vZpbP[WÆµÄL¼È Fe5) â Wien2k28) ª XRS XyNgðvZ·é½ßÌR[hðÀµnßÄ¢é±Æ©çà XRS XyNgðßÉ¨¯éfvZÌKv«ª¢±Æªí©

1)
2)
3)
4)
5)
6)

éB½¾µæ 4 ÍÅq×½æ¤ÉCzû[GlM[ÌèÉÂ¢ÄÍå¢ÉüPÌ]nªéæ¤¾BXRS ÌÂà¤êÂÌÂ\«ÍCLæ÷×\¢iEXAFSjÅéBX üzû@ÆÌÞ«©çCXRS ÌLæ÷×\¢ª¨¿ÌÇ\¢ÌèÊI]¿É¨¢ÄLøÈîñÅ

é±Æªª³êæ¤BÀÛ»êçðp¢Ä\¢]¿ðsÁ½¤ñà

éBLæ\¢ÌðßÍdqoÉqßÉîÃ­_Å

èC±êª 1 ÈãÌðÅªè³ê½f[^

ÌðÍÉKp·é±ÆªÅ«È¢B¡ãCdqoÉqß

7)

8)
9)

10)

ð´¦½ X üñe«U_Ìm§ªñíÉÒ½êéÆ
±ëÅ

éB

XRS XyNgðßÉ¨¯éÅàî{IÅdvÈ|C11)gÍC½xàJèÔ·ª S/N äªå«¢XyNgð12)ªè·é±ÆÅ

13)éBèÊIÈðÍÉÏ¦¤éLæ÷×\¢ðªè·é½ßÉÍXÉIÈüãªßçêé¾ë
¤BobNOEhðá­·éoíÆæèPxÈõ¹ÌKv«ÍùqÌÆ¨èÅéBªÍ»¨æÑoí

14)ÈÇÉÂ¢ÄÍCßNÚð©£éæ¤ÈZpJ­ªÈ³êÄ¨èC»êçÌ±üªñíÉÒ½êéÆ±ëÅ
ûÅõ¹ÉÂ¢ÄÍÇ¤Å

éBê

15)

ë¤©B2010N»ÝC¢EÌ¨ð©éÆGlM[~ÏOðL·éúËõ{ÝªXÉÝ³êÄ¢éæ¤Å

éB±êçÍÔOCOC¨æÑî X ü¹ÆµÄÍñíÉ­ÍÈàÌÅ

éªC

16)

10 keV ÈãÌd X üÌæÅ¢¦Î¡¾ SPring­8 Ìr[­xÍ¼ÌúËõ{Ýð[hµÄ¢éB±Ì SPring­
8 ÌWIAW[^õ¹ðÈÁÄµÄàC³¿

17)á¦ÎCÎä«iFúËõ 18, 347 (2005) ÈÇDá¦ÎCA. Q. R. BaronFªõ¤ 58, 205 (2009); A. Q.
R. BaronFÅÌ¨ 44, 205 (2009) ÈÇDá¦ÎCJ.­P. Rue and A. Shukla: Rev. Mod. Phys. 82, 847(2010) ÈÇD
J. A. Soininen, A. L. Ankudinov and J. J. Rehr: Phys. Rev. B
72, 045136 (2005).
J. J. Rehr: http://leonardo.phys.washington.edu/fe/(2002).
á¦ÎCFcìNvCcHaKFúËõ 2, 35 (1989)EÑ
vjCFcìNvFàkªõi¾cq¾É¡RF Ò
ACs[V[2007), 277_298ÈÇD
C.­Y. Huang, Y. Q. Cai, N. Hiraoka, C.­C. Chen, S.­C.
Chung, Y.­F. Song and K.­L. Tsang: J. Synchrotron Radiat.
15, 50 (2008).
S. K. Lee, P. J. Eng, H.­K. Mao, Y. Meng, M. Newville, M.
Y. Hu and J. Shu: Nat. Matt. 4, 851 (2005).
Y. Q. Cai, H. K. Mao, P. C. Chow J. S. Tse, Y. Ma, S. Pat­
chkovskii, J. F. Shu, V. Struzhkin, R. J. Hemley, H. Ishii, C.
C. Chen, I. Jarrige, C. T. Chen, S. R. Shieh, E. P. Huang and
C. C. Kao: Phys. Rev. Lett. 94, 025502 (2005).
W. L. Mao, H.­K. Mao, Y. Meng, P. J. Eng, M. Y. Hu, P.
Chow, Y. Q. Cai, J. Shu and R. J. Hemley: Science 27, 636(2006).
H. Fukui, S. Huotari, D. Andrault and T. Kawamoto: J.
Chem. Phys. 127, 134502 (2007).
M. Pravica, O. Grubor­Urosevic, M. Hu, P. Chow, B. Yulga
and P. Liermann: J. Phys. Chem. B 111, 11635 (2007).
R. S. Kumar, M. G. Pravica, A. L. Cornelius, M. F. Nicol, M.
Y. Hu and P. C. Chow: Diamond and Related Materials 16,1250 (2007).
Y. Meng, P. J. Eng, J. S. Tse, D. M. Shaw, M. Y. Hu, J. Shu,
S. A. Gramsch, C.c. Kao, R. J. Hemley and H.­k. Mao: Proc.
Natl. Acad. Sci. USA 105, 11640 (2008).
á¦ÎCK. Osumi, S. Sueno, I. Nakai, M. Imafuku, H.
Morikawa, M. Kimata, M. Nomura and O. Shimomura: J.
Phys. Colloque C8, 189_
192 (1986); F. M. Wang and R. In­
galls: Phys. Rev. B 57, 5647_
5654 (1998); Fukui et al.: un­published ÈÇDá¦ÎC´hêFâguÀ n f¯Èw 1 n f¯ÈwüåiZ ¾³C½ ©FC¹CõOC¼älT ÒCâgX 1996), 111ÈÇD
R. J. Hemley, H. K. Mao, P. M. Bell and B. O. Mysen: Phys.
Rev. Lett. 57, 747 (1986).

úËõ Jan. 2011 Vol.24 No.1  1718) Q. Williams and R. Jeanloz: Science 239, 902 (1988).
19) C. Meade, R. J. Hemley and H. K. Mao: Phys. Rev. Lett. 69,
1387 (1992).
20) H. Fukui, M. Kanzaki, N. Hiraoka and Y. Q. Cai: Phys.
Chem. Miner. 36, 171 (2009).
21) J.­F. Lin, H. Fukui, D. Prendergast, T. Okuchi, Y. Q. Cai, N.
Hiraoka, C.­S. Yoo, A. Trave, P. Eng, M. Y. Hu and P.
Chow, Phys. Rev. B 75, 012201 (2007).
22) H. Fukui, M. Kanzaki, N. Hiraoka and Y. Q. Cai: Phys. Rev.
B 78, 012203 (2008).
23) L. Huang, M. Durandurdu and J. Kieer: Nature Matt. 5,977 (2006).
24) J. Badro, D. M. Teter, R. T. Downs, P. Gillet, R. J. Hemley

and J. L. Barrat: Phys. Rev. B 56, 5797 (1997).
T. Sato and N. Funamori: Phys. Rev. Lett. 101, 255502(2008).
26) S. K. Lee, J.­F. Lin, Y. Q. Cai, N. Hiraoka, P. J. Eng, T.
Okuchi, H.­K. Mao, Y. Meng, M. Y. Hu, P. Chow, J. Shu, B.
Li, H. Fukui, B. H. Lee, H. N. Kim and C.­S. Yoo: Proc.
Natl. Acad. Sci. USA 105, 7925 (2008).
27) H. Fukui and N. Hiraoka: in preparation.
28) P. Blaha, K. Schwarz, G. K. H. Madsen, D. Kvasnicka and J.
Luitz: WIEN2k, An Augmented Plane Wave Plus Local Or­
bitals Program for Calculating Crystal Properties Reviseded. (Vienna University of Technology, Vienna, 2001); http://www.wien2k.at/25) ÒÐî äGVºÉ§§åwåw@¨¿w¤È³E­mail: fukuihsci.u­hyogo.ac.jpêåF³¨¿Èw X üªõ@mªðn
2002Nåãåwåw@w¤ÈFn ¨¿ÈwêUmãúÛöC¹C
wmB2002_2004Nú{wpU»ïÁÊ¤õ PDB2003_2004NpæZåwz¨»w¤qõ¤õB2004_
2006NªRåwn ¨¿Èw¤Z
^[³B2006_2009N»w¤d¤úËõÈw¤Z^[¦Í¤õB2009N10æè»EB½ª]Æ¯àtË¤SiNSRRCjäp
XvOGCgäpr[CIt
BX¤õ
E­mail: hiraokaspring8.or.jpêåFX üñe«U ÅÌ¨wmªðn
2000NPHHÆåwi»FºÉ§§åwjw¤ÈmÛöðPÊæ¾Ìã
ÞBNC¯åwÉÄm_¶ðñoµwÊæ¾iwm)B1997Næè»w¤W jAT[`A\VGC
gB2000NæèPxõÈw¤Z^[§ã¤õCN¯¤¦Í¤õB2002Næè¢BúËõ{ÝiESRFj|XghNgtF[B2004Næè»¤ÉÄ|XghNgtF
[ðoÄ»EÉéB

X­ray Spectroscopy at in­situ high­pressure
conditions: X­ray Raman scattering on
silicate glasses
Hiroshi FUKUINozomu HIRAOKA

Department of Material Science, University of Hyogo
3_2_1 Koto, Kamigori, Hyogo 678_1297
SPring­8 Taiwan beamline oce, National Synchrotron Radiation
Research Center, Taiwan, 1_1_1 Koto, Sayo, Hyogo 679_
5148

Abstract Nonresonant inelastic X­ray scattering investigates electronic excitation using hard X­ray, and istherefore applicable to materials under extreme conditions, e.g. high pressure. Excitations of inner­shell elec­
trons measured by so­called X­ray Raman scattering give information on unoccupied electronic structures. In
this article, we discuss applications of X­ray Raman scattering to high pressure studies from technical pointsof view, and then introduce examples of investigations on the pressure variations on local structures of silicate
glasses discussed from the electronic structures.

18  úËõ Jan. 2011 Vol.24 No.1